TW270173B - - Google Patents

Info

Publication number
TW270173B
TW270173B TW083103128A TW83103128A TW270173B TW 270173 B TW270173 B TW 270173B TW 083103128 A TW083103128 A TW 083103128A TW 83103128 A TW83103128 A TW 83103128A TW 270173 B TW270173 B TW 270173B
Authority
TW
Taiwan
Application number
TW083103128A
Original Assignee
Oki Electric Ind Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Oki Electric Ind Co Ltd filed Critical Oki Electric Ind Co Ltd
Application granted granted Critical
Publication of TW270173B publication Critical patent/TW270173B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
    • G01N21/53—Scattering, i.e. diffuse reflection within a body or fluid within a flowing fluid, e.g. smoke
    • G01N21/534—Scattering, i.e. diffuse reflection within a body or fluid within a flowing fluid, e.g. smoke by measuring transmission alone, i.e. determining opacity

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
TW083103128A 1993-04-27 1994-04-09 TW270173B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5101000A JPH06308025A (ja) 1993-04-27 1993-04-27 光透過率測定装置の較正方法

Publications (1)

Publication Number Publication Date
TW270173B true TW270173B (zh) 1996-02-11

Family

ID=14289013

Family Applications (1)

Application Number Title Priority Date Filing Date
TW083103128A TW270173B (zh) 1993-04-27 1994-04-09

Country Status (3)

Country Link
US (1) US5477328A (zh)
JP (1) JPH06308025A (zh)
TW (1) TW270173B (zh)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU1602697A (en) * 1996-02-12 1997-08-28 Shell Internationale Research Maatschappij B.V. Self-correcting spectroscopic process analysis
US5712709A (en) * 1996-04-08 1998-01-27 The United States Of America As Represented By The Secretary Of The Air Force Haze and transmissivity measurements
US5731904A (en) * 1996-08-28 1998-03-24 Hewlett-Packard Co. Fabricating an optical device having at least an optical filter and a mirror
KR20000000411A (ko) * 1999-10-20 2000-01-15 강정근 집광렌즈를 이용한 광투과율 측정 장치
US7093850B2 (en) * 2003-11-14 2006-08-22 Delphi Technologies, Inc. Instrument panel with integral hidden door cover and method of manufacture thereof
US20070246918A1 (en) * 2006-04-21 2007-10-25 Speelman Phillip B Instrument panel with integral hidden door cover and method of manufacture thereof
US20080315566A1 (en) * 2007-06-20 2008-12-25 Andrasik Iii Joseph Instrument panel with integral hidden door cover and method of manufacture thereof
CN109142284B (zh) * 2018-09-03 2021-10-01 重庆惠科金渝光电科技有限公司 穿透率检测方法、装置和计算机可读存储介质
CN114324164A (zh) * 2021-12-30 2022-04-12 武汉比天科技有限责任公司 一种透射式烟度计校准方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3872315A (en) * 1973-12-21 1975-03-18 Babcock & Wilcox Co Radiation sensitive fluid analyzer
US4560873A (en) * 1983-06-17 1985-12-24 Lear Siegler, Inc. Situ multi-channel combustion gas analyzer
EP0132370B1 (en) * 1983-07-22 1989-03-29 Oki Electric Industry Company, Limited Apparatus for measuring optical transmission factor
US5028790A (en) * 1990-05-07 1991-07-02 Lear Siegler Measurement Controls Corporation Apparatus for full-system zero check and window soiling measurement and correction for transmissometers

Also Published As

Publication number Publication date
JPH06308025A (ja) 1994-11-04
US5477328A (en) 1995-12-19

Similar Documents

Publication Publication Date Title
FR2706388B1 (zh)
DK52393D0 (zh)
EP0757573A4 (zh)
IN177852B (zh)
FR2706049B1 (zh)
TW252072B (zh)
IN188818B (zh)
FR2706732B1 (zh)
FR2714118B1 (zh)
FR2706986B1 (zh)
FR2706983B1 (zh)
FR2706799B1 (zh)
FR2707056B1 (zh)
IN178898B (zh)
ITTO960144V0 (zh)
IN175249B (zh)
IN182271B (zh)
IN181211B (zh)
IN181117B (zh)
IN180968B (zh)
IN180505B (zh)
IN182064B (zh)
IN180019B (zh)
IN179366B (zh)
IN175900B (zh)