TW238374B - Inspecting method, inspecting apparatus, and defect correcting method - Google Patents

Inspecting method, inspecting apparatus, and defect correcting method

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Publication number
TW238374B
TW238374B TW82109898A TW82109898A TW238374B TW 238374 B TW238374 B TW 238374B TW 82109898 A TW82109898 A TW 82109898A TW 82109898 A TW82109898 A TW 82109898A TW 238374 B TW238374 B TW 238374B
Authority
TW
Taiwan
Prior art keywords
signal
signal generating
generating step
inspecting
bus line
Prior art date
Application number
TW82109898A
Other languages
Chinese (zh)
Inventor
Naofumi Kondo
Mikio Katayama
Masaya Okamoto
Makoto Miyako
Kiyoshi Nakazawa
Original Assignee
Sharp Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sharp Kk filed Critical Sharp Kk
Application granted granted Critical
Publication of TW238374B publication Critical patent/TW238374B/en

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  • Liquid Crystal (AREA)

Abstract

This invention provides an inspecting method, an inspecting apparatus, and a defect correcting method, for an active matrix substrate including: a gate bus line; a source bus line; a pixel electrode; a switching element for driving the pixel electrode; and a pair of electrodes constituting an auxiliary capacitance. The inspecting method includes: a step of disposing a counter substrate having a face on which a counter electrode is formed so that the face faces the active matrix substrate with a liquid crystal layer interposed therebetween, and connecting signal supplying terminals to gate bus lines and source bus lines and the counter electrode; and a detection step of detecting a defect on the active matrix substrate by performing at least one of a first signal generating step, a second signal generating step, and a third signal generating step. The first, second, and third signal generating steps all include alternately applying an ON signal for turning on the switching element and an OFF signal for turning off the switching element to the gate bus line. The first signal generating step includes applying a first detecting signal having a voltage which changes before the ON signal is applied to the source bus line. The second signal generating step includes applying a second detecting signal having a voltage which changes before and after the ON signal is applied. The third signal generating step includes applying a third detecting signal having a voltage which changes after the ON signal is applied.
TW82109898A 1992-07-13 1993-11-24 Inspecting method, inspecting apparatus, and defect correcting method TW238374B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18547992 1992-07-13

Publications (1)

Publication Number Publication Date
TW238374B true TW238374B (en) 1995-01-11

Family

ID=51400728

Family Applications (1)

Application Number Title Priority Date Filing Date
TW82109898A TW238374B (en) 1992-07-13 1993-11-24 Inspecting method, inspecting apparatus, and defect correcting method

Country Status (1)

Country Link
TW (1) TW238374B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI407397B (en) * 2005-05-18 2013-09-01 Tpo Hong Kong Holding Ltd A liquid crystal display device test circuit, a liquid crystal display device for assembling the circuit, and a test method of a liquid crystal display device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI407397B (en) * 2005-05-18 2013-09-01 Tpo Hong Kong Holding Ltd A liquid crystal display device test circuit, a liquid crystal display device for assembling the circuit, and a test method of a liquid crystal display device

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MM4A Annulment or lapse of patent due to non-payment of fees