TW238374B - Inspecting method, inspecting apparatus, and defect correcting method - Google Patents
Inspecting method, inspecting apparatus, and defect correcting methodInfo
- Publication number
- TW238374B TW238374B TW82109898A TW82109898A TW238374B TW 238374 B TW238374 B TW 238374B TW 82109898 A TW82109898 A TW 82109898A TW 82109898 A TW82109898 A TW 82109898A TW 238374 B TW238374 B TW 238374B
- Authority
- TW
- Taiwan
- Prior art keywords
- signal
- signal generating
- generating step
- inspecting
- bus line
- Prior art date
Links
Landscapes
- Liquid Crystal (AREA)
Abstract
This invention provides an inspecting method, an inspecting apparatus, and a defect correcting method, for an active matrix substrate including: a gate bus line; a source bus line; a pixel electrode; a switching element for driving the pixel electrode; and a pair of electrodes constituting an auxiliary capacitance. The inspecting method includes: a step of disposing a counter substrate having a face on which a counter electrode is formed so that the face faces the active matrix substrate with a liquid crystal layer interposed therebetween, and connecting signal supplying terminals to gate bus lines and source bus lines and the counter electrode; and a detection step of detecting a defect on the active matrix substrate by performing at least one of a first signal generating step, a second signal generating step, and a third signal generating step. The first, second, and third signal generating steps all include alternately applying an ON signal for turning on the switching element and an OFF signal for turning off the switching element to the gate bus line. The first signal generating step includes applying a first detecting signal having a voltage which changes before the ON signal is applied to the source bus line. The second signal generating step includes applying a second detecting signal having a voltage which changes before and after the ON signal is applied. The third signal generating step includes applying a third detecting signal having a voltage which changes after the ON signal is applied.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP18547992 | 1992-07-13 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW238374B true TW238374B (en) | 1995-01-11 |
Family
ID=51400728
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW82109898A TW238374B (en) | 1992-07-13 | 1993-11-24 | Inspecting method, inspecting apparatus, and defect correcting method |
Country Status (1)
Country | Link |
---|---|
TW (1) | TW238374B (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI407397B (en) * | 2005-05-18 | 2013-09-01 | Tpo Hong Kong Holding Ltd | A liquid crystal display device test circuit, a liquid crystal display device for assembling the circuit, and a test method of a liquid crystal display device |
-
1993
- 1993-11-24 TW TW82109898A patent/TW238374B/en not_active IP Right Cessation
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI407397B (en) * | 2005-05-18 | 2013-09-01 | Tpo Hong Kong Holding Ltd | A liquid crystal display device test circuit, a liquid crystal display device for assembling the circuit, and a test method of a liquid crystal display device |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |