TW230844B - - Google Patents

Info

Publication number
TW230844B
TW230844B TW082104683A TW82104683A TW230844B TW 230844 B TW230844 B TW 230844B TW 082104683 A TW082104683 A TW 082104683A TW 82104683 A TW82104683 A TW 82104683A TW 230844 B TW230844 B TW 230844B
Authority
TW
Taiwan
Application number
TW082104683A
Other languages
Chinese (zh)
Original Assignee
Siemens Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens Ag filed Critical Siemens Ag
Application granted granted Critical
Publication of TW230844B publication Critical patent/TW230844B/zh

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/77Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
    • H01L21/78Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
    • H01L21/82Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L28/00Passive two-terminal components without a potential-jump or surface barrier for integrated circuits; Details thereof; Multistep manufacturing processes therefor
    • H01L28/40Capacitors
    • H01L28/60Electrodes
    • H01L28/82Electrodes with an enlarged surface, e.g. formed by texturisation
    • H01L28/90Electrodes with an enlarged surface, e.g. formed by texturisation having vertical extensions
    • H01L28/91Electrodes with an enlarged surface, e.g. formed by texturisation having vertical extensions made by depositing layers, e.g. by depositing alternating conductive and insulating layers

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Semiconductor Memories (AREA)
TW082104683A 1992-06-30 1993-06-12 TW230844B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE4221431A DE4221431A1 (en) 1992-06-30 1992-06-30 Manufacturing process for a key capacitor

Publications (1)

Publication Number Publication Date
TW230844B true TW230844B (en) 1994-09-21

Family

ID=6462140

Family Applications (1)

Application Number Title Priority Date Filing Date
TW082104683A TW230844B (en) 1992-06-30 1993-06-12

Country Status (6)

Country Link
EP (1) EP0647356A1 (en)
JP (1) JPH07508136A (en)
KR (1) KR950702339A (en)
DE (1) DE4221431A1 (en)
TW (1) TW230844B (en)
WO (1) WO1994000874A1 (en)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4221432C2 (en) * 1992-06-30 1994-06-09 Siemens Ag Global planarization process for integrated semiconductor circuits or micromechanical components
US5714779A (en) * 1992-06-30 1998-02-03 Siemens Aktiengesellschaft Semiconductor memory device having a transistor, a bit line, a word line and a stacked capacitor
KR950021710A (en) * 1993-12-01 1995-07-26 김주용 Capacitor Manufacturing Method of Semiconductor Device
US5840623A (en) * 1995-10-04 1998-11-24 Advanced Micro Devices, Inc. Efficient and economical method of planarization of multilevel metallization structures in integrated circuits using CMP
JPH10144882A (en) * 1996-11-13 1998-05-29 Oki Electric Ind Co Ltd Capacitor of semiconductor memory element and its manufacture
WO1998028789A1 (en) * 1996-12-20 1998-07-02 Hitachi, Ltd. Semiconductor storage device and method for manufacturing the same
GB2322964B (en) * 1997-03-07 2001-10-17 United Microelectronics Corp Polysilicon CMP process for high-density DRAM cell structures

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2524862B2 (en) * 1990-05-01 1996-08-14 三菱電機株式会社 Semiconductor memory device and manufacturing method thereof
US5162248A (en) * 1992-03-13 1992-11-10 Micron Technology, Inc. Optimized container stacked capacitor DRAM cell utilizing sacrificial oxide deposition and chemical mechanical polishing

Also Published As

Publication number Publication date
DE4221431A1 (en) 1994-01-05
KR950702339A (en) 1995-06-19
EP0647356A1 (en) 1995-04-12
WO1994000874A1 (en) 1994-01-06
JPH07508136A (en) 1995-09-07

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