TW227644B - - Google Patents
Info
- Publication number
- TW227644B TW227644B TW082108613A TW82108613A TW227644B TW 227644 B TW227644 B TW 227644B TW 082108613 A TW082108613 A TW 082108613A TW 82108613 A TW82108613 A TW 82108613A TW 227644 B TW227644 B TW 227644B
- Authority
- TW
- Taiwan
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4338530A JP2899492B2 (ja) | 1992-12-18 | 1992-12-18 | プリント基板検査方法と検査装置 |
| JP5042548A JPH06260796A (ja) | 1993-03-03 | 1993-03-03 | 両面基板検査装置の引張力付加装置 |
| JP009424U JPH0666985U (ja) | 1993-03-08 | 1993-03-08 | クランプ装置 |
| JP1993021056U JP2582838Y2 (ja) | 1993-04-22 | 1993-04-22 | 基板厚自己調整クランプ装置 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW227644B true TW227644B (US06235095-20010522-C00021.png) | 1994-08-01 |
Family
ID=27455174
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW082108613A TW227644B (US06235095-20010522-C00021.png) | 1992-12-18 | 1993-10-16 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US5461323A (US06235095-20010522-C00021.png) |
| EP (1) | EP0605818A1 (US06235095-20010522-C00021.png) |
| TW (1) | TW227644B (US06235095-20010522-C00021.png) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117929812A (zh) * | 2024-03-21 | 2024-04-26 | 吉林电子信息职业技术学院 | 一种电子元件检测设备 |
Families Citing this family (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5550483A (en) * | 1994-11-18 | 1996-08-27 | International Business Machines | High speed test probe positioning system |
| JP3821171B2 (ja) * | 1995-11-10 | 2006-09-13 | オー・エイチ・ティー株式会社 | 検査装置及び検査方法 |
| US6051983A (en) * | 1997-11-03 | 2000-04-18 | International Business Machines Corporation | Positive side support test assembly |
| US6366107B2 (en) * | 1998-04-28 | 2002-04-02 | Delaware Capital Formation, Inc. | Loading mechanism for automated verification and repair station |
| US6192570B1 (en) | 1999-04-23 | 2001-02-27 | Cummins Engine Co Inc | Method for the remanufacturing of a sealed module |
| US6657449B2 (en) * | 2000-12-21 | 2003-12-02 | Hansaem Digitec Co., Ltd. | Test pin unit for PCB test device and feeding device of the same |
| US7231833B2 (en) * | 2003-04-01 | 2007-06-19 | Intel Corporation | Board deflection metrology using photoelectric amplifiers |
| US6824410B1 (en) | 2004-04-16 | 2004-11-30 | Kingston Technology Corp. | Zero-insertion-force hinged clam-shell socket for testing memory modules |
| US20130335110A1 (en) * | 2012-06-15 | 2013-12-19 | Polyvalor, Limited Partnership | Planar circuit test fixture |
| CN104483195B (zh) * | 2014-12-11 | 2018-01-30 | 广州兴森快捷电路科技有限公司 | 柔性板材的柔软度测试方法 |
| CN104965167A (zh) * | 2015-07-21 | 2015-10-07 | 深圳市汉匠自动化科技有限公司 | 电路板自动检测设备 |
| CN105929322A (zh) * | 2016-05-10 | 2016-09-07 | 国网山东省电力公司聊城供电公司 | 断路器分合闸线圈物性检测装置 |
| CN107547077B (zh) * | 2016-06-27 | 2021-07-13 | 中兴通讯股份有限公司 | 一种微动开关结构及光传输设备 |
| CN109061458B (zh) * | 2018-08-28 | 2024-07-02 | 杭州杰涵机械科技有限公司 | 一种断路器二次回路自动检测装置及其操作方法 |
| CN112034326B (zh) * | 2020-08-19 | 2023-09-08 | 宜宾卓邦科技有限公司 | 一种芯片检测装置 |
| CN112986624B (zh) * | 2021-05-20 | 2021-07-27 | 南京亚尔软件测试有限公司 | Ied柔性测试系统用多功能辅助机构 |
| CN115078974A (zh) * | 2022-07-23 | 2022-09-20 | 隋大明 | 一种线路板测试平台 |
| CN115629288B (zh) * | 2022-09-06 | 2024-05-24 | 广东若铂智能机器人有限公司 | 一种伺服驱动器功率板品质检查系统 |
| CN117250207B (zh) * | 2023-11-17 | 2024-01-30 | 四川睿杰鑫电子股份有限公司 | 一种柔性电路板检测装置及检查方法 |
| CN117741204B (zh) * | 2024-02-20 | 2024-05-07 | 俐玛光电科技(北京)有限公司 | 一种电路板测试工装夹具和电路板布置方法 |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE2953597A1 (de) * | 1979-05-08 | 1981-04-09 | Tokyo Shibaura Electric Co | Pulse motor driving apparatus for automatic testing system |
| US4818933A (en) * | 1986-10-08 | 1989-04-04 | Hewlett-Packard Company | Board fixturing system |
| US4857009A (en) * | 1988-07-21 | 1989-08-15 | Hewlett-Packard Company | Fixture latching mechanism |
| US5107206A (en) * | 1990-05-25 | 1992-04-21 | Tescon Co., Ltd. | Printed circuit board inspection apparatus |
| US5153504A (en) * | 1991-04-23 | 1992-10-06 | International Business Machines Corporation | Pneumatically actuated hold down gate |
| US5214374A (en) * | 1991-12-12 | 1993-05-25 | Everett/Charles Contact Products, Inc. | Dual level test fixture |
-
1993
- 1993-10-16 TW TW082108613A patent/TW227644B/zh active
- 1993-11-23 US US08/155,757 patent/US5461323A/en not_active Expired - Fee Related
- 1993-12-15 EP EP93120207A patent/EP0605818A1/en not_active Withdrawn
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117929812A (zh) * | 2024-03-21 | 2024-04-26 | 吉林电子信息职业技术学院 | 一种电子元件检测设备 |
Also Published As
| Publication number | Publication date |
|---|---|
| EP0605818A1 (en) | 1994-07-13 |
| US5461323A (en) | 1995-10-24 |
