TW222040B - - Google Patents

Info

Publication number
TW222040B
TW222040B TW082101589A TW82101589A TW222040B TW 222040 B TW222040 B TW 222040B TW 082101589 A TW082101589 A TW 082101589A TW 82101589 A TW82101589 A TW 82101589A TW 222040 B TW222040 B TW 222040B
Authority
TW
Taiwan
Application number
TW082101589A
Other languages
Chinese (zh)
Original Assignee
Hitachi Seisakusyo Kk
Hitachi Cho Lsi Eng Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Seisakusyo Kk, Hitachi Cho Lsi Eng Co Ltd filed Critical Hitachi Seisakusyo Kk
Application granted granted Critical
Publication of TW222040B publication Critical patent/TW222040B/zh

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/06Auxiliary circuits, e.g. for writing into memory
    • G11C16/10Programming or data input circuits
    • G11C16/14Circuits for erasing electrically, e.g. erase voltage switching circuits
    • G11C16/16Circuits for erasing electrically, e.g. erase voltage switching circuits for erasing blocks, e.g. arrays, words, groups
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/06Auxiliary circuits, e.g. for writing into memory
    • G11C16/34Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G11C16/3436Arrangements for verifying correct programming or erasure
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10BELECTRONIC MEMORY DEVICES
    • H10B41/00Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates
    • H10B41/30Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates characterised by the memory core region
TW082101589A 1992-03-26 1993-03-04 TW222040B (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP6809992 1992-03-26
JP01809593A JP3489845B2 (ja) 1992-03-26 1993-01-08 フラッシュメモリ、及びデータプロセッサ

Publications (1)

Publication Number Publication Date
TW222040B true TW222040B (de) 1994-04-01

Family

ID=13363959

Family Applications (1)

Application Number Title Priority Date Filing Date
TW082101589A TW222040B (de) 1992-03-26 1993-03-04

Country Status (3)

Country Link
JP (1) JP3489845B2 (de)
KR (1) KR100279781B1 (de)
TW (1) TW222040B (de)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI618090B (zh) * 2016-05-17 2018-03-11 超捷公司 具有個別記憶體單元讀取、程式化、及抹除之快閃記憶體陣列

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5966332A (en) * 1995-11-29 1999-10-12 Sanyo Electric Co., Ltd. Floating gate memory cell array allowing cell-by-cell erasure
US6829174B2 (en) * 2003-01-30 2004-12-07 Macronix International Co., Ltd. Method of narrowing threshold voltage distribution
JP3976774B1 (ja) 2006-03-10 2007-09-19 株式会社Genusion 不揮発性半導体記憶装置およびその制御方法
KR101489885B1 (ko) 2007-11-21 2015-02-06 삼성전자주식회사 개선된 신뢰성을 갖는 트랩형 비휘발성 메모리 장치 및 그동작 방법
US8400857B2 (en) * 2008-07-28 2013-03-19 Nxp B.V. Circuit for sensing the content of a semiconductor memory cell

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI618090B (zh) * 2016-05-17 2018-03-11 超捷公司 具有個別記憶體單元讀取、程式化、及抹除之快閃記憶體陣列

Also Published As

Publication number Publication date
JPH05325573A (ja) 1993-12-10
KR930020468A (ko) 1993-10-19
KR100279781B1 (ko) 2001-02-01
JP3489845B2 (ja) 2004-01-26

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