TW202403117A - Surface treated copper foil, copper foil roll, copper clad laminate, and printed wiring board - Google Patents

Surface treated copper foil, copper foil roll, copper clad laminate, and printed wiring board Download PDF

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TW202403117A
TW202403117A TW112112387A TW112112387A TW202403117A TW 202403117 A TW202403117 A TW 202403117A TW 112112387 A TW112112387 A TW 112112387A TW 112112387 A TW112112387 A TW 112112387A TW 202403117 A TW202403117 A TW 202403117A
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copper foil
treated copper
treatment
less
treated
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佐野惇郎
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日商古河電氣工業股份有限公司
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B15/00Layered products comprising a layer of metal
    • B32B15/01Layered products comprising a layer of metal all layers being exclusively metallic
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C26/00Coating not provided for in groups C23C2/00 - C23C24/00
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D5/00Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
    • C25D5/10Electroplating with more than one layer of the same or of different metals
    • C25D5/12Electroplating with more than one layer of the same or of different metals at least one layer being of nickel or chromium
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D5/00Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
    • C25D5/16Electroplating with layers of varying thickness
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D5/00Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
    • C25D5/48After-treatment of electroplated surfaces
    • C25D5/52After-treatment of electroplated surfaces by brightening or burnishing
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D7/00Electroplating characterised by the article coated
    • C25D7/06Wires; Strips; Foils
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25FPROCESSES FOR THE ELECTROLYTIC REMOVAL OF MATERIALS FROM OBJECTS; APPARATUS THEREFOR
    • C25F3/00Electrolytic etching or polishing
    • C25F3/16Polishing
    • C25F3/22Polishing of heavy metals
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/09Use of materials for the conductive, e.g. metallic pattern

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Organic Chemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Mechanical Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Electroplating Methods And Accessories (AREA)
  • Laminated Bodies (AREA)
  • Other Surface Treatments For Metallic Materials (AREA)
  • Parts Printed On Printed Circuit Boards (AREA)

Abstract

This surface-treated copper foil has one surface (A) and the other surface (B), wherein the surface (A) satisfies the following requirements (I) and (II). Requirement (I): on the surface of the surface-treated copper foil, the mirror surface glossiness ratio R(75 DEG) [GsMD (75 DEG)/GsTD (75 DEG)], as measured according to JIS Z 8741:1997, of the 75-degree mirror surface glossiness GsMD (75 DEG) of MD to the 75-degree mirror surface glossiness GsTD (75 DEG) of TD is 0.90-1.60 inclusive. Requirement (II): the developed area ratio (Sdr) as measured by a laser microscope on the surface of the surface-treated copper foil is 3.00% or less.

Description

表面處理銅箔、銅箔卷、銅張積層板、及印刷電路板Surface treated copper foil, copper foil rolls, copper sheet laminated boards, and printed circuit boards

本發明是關於表面處理銅箔、該表面處理銅箔所製成的銅箔卷、及包含該表面處理銅箔的銅張積層板及印刷電路板。The present invention relates to surface-treated copper foil, copper foil rolls made of the surface-treated copper foil, and copper sheet laminates and printed circuit boards containing the surface-treated copper foil.

表面處理銅箔可用於鋰離子二次電池等二次電池或印刷電路板等各種用途。Surface-treated copper foil can be used in various applications such as secondary batteries such as lithium-ion secondary batteries or printed circuit boards.

通常,銅箔容易氧化,故防鏽處理一般是於其表面施加使用Zn(鋅)或Cr(鉻)等金屬的防鏽處理(金屬防鏽處理)或使用包含Si(矽)的有機化合物等有機材料的防鏽處理(有機防鏽處理)。例如,專利文獻1建議具有耐鏽性及耐變色性的表面處理銅箔是具有設置於銅箔的有機層的表面處理銅箔。 [先前技術文獻] [專利文獻] Generally, copper foil is easily oxidized, so antirust treatment generally involves applying antirust treatment (metal antirust treatment) using metals such as Zn (zinc) or Cr (chromium) on the surface, or using organic compounds containing Si (silicon), etc. Anti-rust treatment of organic materials (organic anti-rust treatment). For example, Patent Document 1 proposes that a surface-treated copper foil having rust resistance and discoloration resistance has an organic layer provided on the copper foil. [Prior technical literature] [Patent Document]

[專利文獻1] 特開2021-028165號公報[Patent Document 1] Japanese Patent Application Publication No. 2021-028165

[發明所欲解決的問題][Problem to be solved by the invention]

上述防鏽處理可期待一定的防鏽效果。但是,銅箔亦不乏例如製造後經過3個月到1年左右的長期保存才使用,在該種情形下,即使是施加上述防鏽處理的表面處理銅箔,其表面仍可能發生變色。該種變色在保存於高濕環境的情形下更為明顯。A certain anti-rust effect can be expected from the above-mentioned anti-rust treatment. However, there are cases where copper foil is stored for a long period of time, for example, from 3 months to 1 year after production. In this case, even if the surface-treated copper foil is subjected to the above-mentioned anti-rust treatment, the surface may still be discolored. This discoloration is more obvious when stored in a high-humidity environment.

表面處理銅箔的表面的變色可認為主要是銅箔表面的氧化所致,它不只會有銅箔製品的外觀不良的問題,亦會有引起製品本身的性能惡化的隱憂的問題。Surface discoloration of surface-treated copper foil can be considered to be mainly caused by oxidation of the copper foil surface. It not only causes poor appearance of copper foil products, but also causes the hidden problem of deteriorating the performance of the product itself.

因此,本發明的目的在於提供:無論保存環境的濕度如何,即使在長時間(例如,3個月至1年左右)保存表面處理銅箔的情形下,仍可有效抑制該銅箔表面的變色,適合長期保存的表面處理銅箔、該表面處理銅箔所製成的銅箔卷、及包含該表面處理銅箔的銅張積層板及印刷電路板。 [解決問題的手段] Therefore, an object of the present invention is to provide a method that can effectively suppress discoloration of the surface of a surface-treated copper foil even when the surface-treated copper foil is stored for a long time (for example, about 3 months to 1 year) regardless of the humidity of the storage environment. , surface-treated copper foil suitable for long-term storage, copper foil rolls made of the surface-treated copper foil, and copper laminates and printed circuit boards containing the surface-treated copper foil. [Methods to solve problems]

本發明的主要構成如下: [1]一種表面處理銅箔,其具有一側的面(A)及另一側的面(B); 前述面(A)滿足下述要件(I)及(II): ・要件(I):於前述表面處理銅箔的表面,依據JIS Z 8741:1997所測量的MD的75度鏡面光澤度Gs MD(75°)相對於TD的75度鏡面光澤度Gs TD(75°)的鏡面光澤度比R(75°)[Gs MD(75°)/Gs TD(75°)]為0.90以上且1.60以下。 ・要件(II):於前述表面處理銅箔的表面,由雷射顯微鏡所測量的展開面積比(Sdr)為3.00%以下。 [2]如上述[1]所記載的表面處理銅箔,其中:前述面(B)更滿足下述要件(III)及(IV): ・要件(III):於前述表面處理銅箔的表面,依據JIS Z 8741:1997所測量的MD的75度鏡面光澤度Gs MD(75°)相對於TD的75度鏡面光澤度Gs TD(75°)的鏡面光澤度比R(75°)[Gs MD(75°)/Gs TD(75°)]為0.60以上且1.50以下。 ・要件(IV):於前述表面處理銅箔的表面,由雷射顯微鏡所測量的展開面積比(Sdr)為300%以下。 [3]如上述[1]或[2]所記載的表面處理銅箔,其中:在前述要件(I)中,前述鏡面光澤度比R(75°)[Gs MD(75°)/Gs TD(75°)]為0.95以上且1.50以下。 [4]如上述[1]~[3]之中任一項所記載的表面處理銅箔,其中:於前述面(A),Zn附著量為0.001mg/dm 2以上且0.800mg/dm 2以下,或Cr附著量為0.001mg/dm 2以上且0.500mg/dm 2以下。 [5]如請求項1~4之中任一項所記載的表面處理銅箔,其中:於前述面(A),Si附著量為0.001mg/dm 2以上且0.500mg/dm 2以下。 [6]如上述[2]~[5]之中任一項所記載的表面處理銅箔,其中:在前述要件(IV)中,前述展開面積比(Sdr)為120%以下。 [7]如上述[6]所記載的表面處理銅箔,其中:在前述要件(IV)中,前述展開面積比(Sdr)為3.00%以下。 [8]如上述[1]~[7]之中任一項所記載的表面處理銅箔,其為電解銅箔。 [9]如上述[8]所記載的表面處理銅箔,其中:前述面(A)為從旋轉滾筒狀陰極剝離之面所衍生的面。 [10]一種銅箔卷,其為如上述[1]~[9]之中任一項所記載的表面處理銅箔所製成的銅箔卷; 將前述面(A)作為外側,在前述面(A)與前述面(B)接觸的狀態下捲繞而成。 [11]一種銅張積層板,其包含如上述[1]~[9]之中任一項所記載的表面處理銅箔。 [12]如上述[11]所記載的銅張積層板,其中:前述面(B)為與樹脂基材黏貼之面。 [13]一種印刷電路板,包含如上述[1]~[9]之中任一項所記載的表面處理銅箔。 [發明的效果] The main components of the present invention are as follows: [1] A surface-treated copper foil having one side (A) and the other side (B); the aforementioned side (A) satisfies the following requirements (I) and (II) ): ・Requirement (I): On the surface of the aforementioned surface-treated copper foil, the 75-degree specular gloss Gs MD (75°) of MD measured in accordance with JIS Z 8741:1997 is compared to the 75-degree specular gloss Gs TD of TD. The specular gloss ratio R (75°) [Gs MD (75°)/Gs TD (75°)] of (75°) is 0.90 or more and 1.60 or less.・Requirement (II): The developed area ratio (Sdr) measured by a laser microscope on the surface of the aforementioned surface-treated copper foil is 3.00% or less. [2] The surface-treated copper foil as described in the above [1], wherein the above-mentioned surface (B) further satisfies the following requirements (III) and (IV): ・Requirement (III): on the surface of the above-mentioned surface-treated copper foil , the specular gloss ratio R (75°) of MD's 75-degree specular gloss Gs MD (75°) to TD's 75-degree specular gloss Gs TD (75°) measured in accordance with JIS Z 8741:1997 MD (75°)/Gs TD (75°)] is 0.60 or more and 1.50 or less.・Requirement (IV): The developed area ratio (Sdr) measured by a laser microscope on the surface of the aforementioned surface-treated copper foil is 300% or less. [3] The surface-treated copper foil according to the above [1] or [2], wherein: in the aforementioned requirement (I), the aforementioned specular gloss ratio R (75°) [Gs MD (75°)/Gs TD (75°)] is 0.95 or more and 1.50 or less. [4] The surface-treated copper foil according to any one of [1] to [3] above, wherein the Zn adhesion amount on the surface (A) is 0.001 mg/dm 2 or more and 0.800 mg/dm 2 or less, or the Cr adhesion amount is 0.001 mg/dm 2 or more and 0.500 mg/dm 2 or less. [5] The surface-treated copper foil according to any one of claims 1 to 4, wherein the Si adhesion amount on the surface (A) is 0.001 mg/dm 2 or more and 0.500 mg/dm 2 or less. [6] The surface-treated copper foil according to any one of [2] to [5] above, wherein in the above requirement (IV), the developed area ratio (Sdr) is 120% or less. [7] The surface-treated copper foil according to the above [6], wherein in the above requirement (IV), the developed area ratio (Sdr) is 3.00% or less. [8] The surface-treated copper foil according to any one of [1] to [7] above, which is an electrolytic copper foil. [9] The surface-treated copper foil according to the above [8], wherein the surface (A) is a surface derived from the surface on which the rotating drum-shaped cathode is peeled off. [10] A copper foil roll made of the surface-treated copper foil according to any one of the above [1] to [9]; with the aforementioned surface (A) as the outer side, the aforementioned surface It is wound with the surface (A) in contact with the aforementioned surface (B). [11] A copper laminated board including the surface-treated copper foil according to any one of the above [1] to [9]. [12] The copper laminated board according to the above [11], wherein: the aforementioned surface (B) is the surface bonded to the resin base material. [13] A printed circuit board including the surface-treated copper foil according to any one of [1] to [9] above. [Effects of the invention]

本發明可提供:無論保存環境的濕度如何,即使在長時間保存表面處理銅箔的情形下,仍可有效抑制該銅箔表面的變色,適合長期保存的表面處理銅箔、該表面處理銅箔所製成的銅箔卷、及包含該表面處理銅箔的銅張積層板及印刷電路板。The present invention can provide: regardless of the humidity of the storage environment, even if the surface-treated copper foil is stored for a long time, the discoloration of the surface of the copper foil can still be effectively suppressed, and the surface-treated copper foil is suitable for long-term storage. The surface-treated copper foil The produced copper foil roll, and the copper laminated board and printed circuit board containing the surface-treated copper foil.

針對本發明的表面處理銅箔、銅箔卷、銅張積層板、及印刷電路板的實施形態,詳細說明如下。 值得注意的是,在本說明書中,關於數值的記載,所謂「A~B」的用語意指「A以上且B以下」(A<B的情形)或「A以下且B以上」(A>B的情形)。又,在本發明中,較佳態樣的組合為更佳態樣。 Embodiments of the surface-treated copper foil, copper foil roll, copper sheet laminated board, and printed circuit board of the present invention will be described in detail below. It is worth noting that in this specification, regarding the description of numerical values, the term "A to B" means "above and below B" (when A<B) or "a below and above B" (A> B situation). Furthermore, in the present invention, a combination of preferred aspects is a more preferred aspect.

[表面處理銅箔] 本發明的表面處理銅箔(以下可能簡稱為「銅箔」)為具有一側的面(A)及另一側的面(B)的表面處理銅箔,其特徵在於,前述面(A)的特徵在於滿足下述要件(I)及(II): ・要件(I):於前述表面處理銅箔的表面,依據JIS Z 8741:1997所測量的MD的75度鏡面光澤度Gs MD(75°)相對於TD的75度鏡面光澤度Gs TD(75°)的鏡面光澤度比R(75°)[Gs MD(75°)/Gs TD(75°)]為0.90以上且1.60以下; ・要件(II):於前述表面處理銅箔的表面,由雷射顯微鏡所測量的展開面積比(Sdr)為3.00%以下。 在此,MD(Machine Direction)為製造銅箔基體(亦可能稱為「原箔」)時銅箔基體流動的方向(亦可能稱為RD(Roll Direction)),而TD(Transverse Direction)為垂直於MD的方向。 [Surface-treated copper foil] The surface-treated copper foil of the present invention (hereinafter may be simply referred to as "copper foil") is a surface-treated copper foil having one side (A) and the other side (B), and is characterized by: , the aforementioned surface (A) is characterized by satisfying the following requirements (I) and (II): ・Requirement (I): The surface of the aforementioned surface-treated copper foil has a 75-degree mirror surface with MD measured in accordance with JIS Z 8741:1997 The specular gloss ratio R (75°) [ Gs MD (75°)/Gs TD (75°)] of the 75-degree specular gloss Gs TD ( 75°) relative to TD is 0.90 Above and below 1.60; ・Requirement (II): The developed area ratio (Sdr) measured by a laser microscope on the surface of the aforementioned surface-treated copper foil is 3.00% or below. Here, MD (Machine Direction) is the direction in which the copper foil base flows (may also be called RD (Roll Direction)) when manufacturing the copper foil base (may also be called "original foil"), while TD (Transverse Direction) is the vertical direction. in the direction of MD.

本發明可獲得:無論保存環境的濕度如何,即使在長時間保存表面處理銅箔的情形下,仍可有效抑制該銅箔表面的變色,適合長期保存的表面處理銅箔。 獲得這種效果的詳細理由尚不清楚,但可認為其中一個理由如下。 The present invention can obtain: regardless of the humidity of the storage environment, even if the surface-treated copper foil is stored for a long time, the discoloration of the surface of the copper foil can still be effectively suppressed, and the surface-treated copper foil is suitable for long-term storage. The detailed reason for obtaining this effect is not clear, but one of the reasons is considered to be as follows.

首先,本發明人等詳細研究銅箔表面的變色的結果,推測其主要原因如下。 通常,銅箔表面會施加防鏽處理,但在長期保存中,因銅箔基體與防鏽處理層之間會產生相互擴散或合金化等,銅可能露出於表面,銅箔的表面會氧化。 特別是,銅箔表面存在製造過程所進行的處理所引起的沿著MD延伸的條紋狀的凹凸。根據該些輕微凹凸形狀,防鏽處理的厚度會不同,故因該厚度的不同,防鏽能力會產生差異。其結果,可認為存在於條紋狀的防鏽處理的較薄部分在長期保存中,容易發生銅的氧化。 又,特別是,有機防鏽處理難以均勻處理,沿著MD亦容易發生處理不均。因此,可能產生沿著MD局部沒有防鏽材料覆蓋的地方或覆蓋厚度非常薄的地方。可認為該種地方在長期保存中,容易發生銅的氧化。 如上所述,於銅箔表面沿著MD存在的容易發生銅的氧化的部分在長期保存後,可能出現沿著MD的條紋狀的變色(以下可能稱為「MD條紋狀變色」),推測該種MD條紋狀變色是長期保存銅箔時所產生的銅箔表面的變色的主要原因。又,若銅箔表面為愈平滑之面,則愈容易肉眼確認上述MD條紋狀變色。 First, the present inventors studied the results of discoloration on the copper foil surface in detail, and speculated that the main reasons are as follows. Usually, anti-rust treatment is applied to the surface of copper foil. However, during long-term storage, due to mutual diffusion or alloying between the copper foil base and the anti-rust treatment layer, copper may be exposed on the surface, and the surface of the copper foil may be oxidized. In particular, the surface of the copper foil has stripe-like irregularities extending along the MD caused by the treatment performed during the manufacturing process. Depending on the slight uneven shape, the thickness of the anti-rust treatment will be different, so the anti-rust ability will vary depending on the thickness. As a result, it is considered that the thin portions present in the stripe-shaped anti-rust treatment are prone to copper oxidation during long-term storage. In addition, in particular, organic anti-rust treatment is difficult to achieve uniform treatment, and treatment unevenness is likely to occur along the MD. Therefore, there may be places along the MD that are not covered with rust-proof material or places where the coverage thickness is very thin. It can be considered that copper oxidation is prone to occur in this kind of place during long-term storage. As mentioned above, after long-term storage, stripe-like discoloration along the MD (hereinafter may be referred to as "MD stripe discoloration") may occur in the portions of the copper foil surface that are prone to copper oxidation. MD stripe discoloration is the main cause of discoloration on the surface of copper foil that occurs when copper foil is stored for a long time. Moreover, the smoother the copper foil surface is, the easier it is to visually confirm the above-mentioned MD stripe-like discoloration.

另一方面,銅箔表面的變色通常亦受到保存環境的濕度大幅影響。例如,在有乾燥器等除濕環境下,可抑制銅箔表面的變色發生速率。可認為這是因為在濕度較高的環境下,銅箔表面形成局部電池,容易發生銅的氧化,但除濕可抑制其發生。 但是,現實上難以使銅箔製品的保存環境處於除濕環境下。因此,希望即使不在除濕環境下亦可抑制銅箔表面的變色發生。 On the other hand, the discoloration of the copper foil surface is usually greatly affected by the humidity of the storage environment. For example, in a dehumidified environment such as a dryer, the rate of discoloration on the copper foil surface can be suppressed. It is believed that this is because in an environment with high humidity, local cells are formed on the surface of the copper foil, and oxidation of copper is prone to occur, but dehumidification can inhibit its occurrence. However, it is actually difficult to keep copper foil products in a dehumidified environment. Therefore, it is desired to suppress the discoloration of the copper foil surface even if it is not in a dehumidified environment.

因此,本發明人等反覆努力研究的結果,發現到:透過將銅箔的一側的面(A)的表面控制成上述指定的表面形狀,特別是可有效防止長期保存銅箔時所產生的銅箔表面的MD條紋狀變色。詳細機制尚不清楚,但透過將銅箔的面(A)設定成展開面積比(Sdr)為3.00%以下的平滑面(要件(II)),且設定成鏡面光澤度比R(75°)為0.90以上且1.60以下的具有各向異性的面(要件(I)),可有效抑制面(A)的防鏽處理所產生的處理厚度的差異或處理不均的發生,可認為據此可抑制長期保存中的銅的氧化的發生。Therefore, as a result of repeated diligent research, the present inventors found that by controlling the surface of one side (A) of the copper foil to have the above-specified surface shape, it is possible to effectively prevent defects that occur especially when the copper foil is stored for a long period of time. MD stripe-like discoloration on the surface of copper foil. The detailed mechanism is not yet clear, but by setting the surface (A) of the copper foil to a smooth surface with a developed area ratio (Sdr) of 3.00% or less (requirement (II)), and setting it to a specular gloss ratio R (75°) It is considered that it is an anisotropic surface (requirement (I)) between 0.90 and 1.60, which can effectively suppress the difference in treatment thickness or uneven treatment caused by the anti-rust treatment of surface (A). Suppresses copper oxidation during long-term storage.

又,本發明的該種表面處理銅箔例如適合用於印刷電路板的用途。在使用本發明的表面處理銅箔的情形下,可實現優異的傳遞特性。In addition, the surface-treated copper foil of the present invention is suitable for use in printed circuit boards, for example. In the case of using the surface-treated copper foil of the present invention, excellent transfer characteristics can be achieved.

針對本發明的表面處理銅箔,詳細說明如下。The surface-treated copper foil of the present invention will be described in detail below.

首先,本發明的表面處理銅箔將表裏面當中一側的面定義成「面(A)」,另一側的面定義成「面(B)」。亦即,本發明的表面處理銅箔具有一側的面(A)及另一側的面(B)(以下可能簡稱為「面(A)」及「面(B)」)。 又,本發明的表面處理銅箔於銅箔基體的雙面(面(A)及面(B))具有包含防鏽處理層的表面處理皮膜。防鏽處理層為具有抑制銅的氧化的效果的層即可,亦可為金屬防鏽處理所產生的處理層,亦可為有機防鏽處理所產生的處理層,亦可併用它們。 First, in the surface-treated copper foil of the present invention, one surface between the front and rear surfaces is defined as "surface (A)", and the other surface is defined as "surface (B)". That is, the surface-treated copper foil of the present invention has one side (A) and the other side (B) (hereinafter may be simply referred to as "side (A)" and "side (B)"). Furthermore, the surface-treated copper foil of the present invention has a surface-treated film including an anti-rust treatment layer on both sides (surface (A) and surface (B)) of the copper foil base. The anti-rust treatment layer may be a layer that has the effect of inhibiting the oxidation of copper. It may be a treatment layer resulting from metal anti-rust treatment or an organic anti-rust treatment, or they may be used in combination.

又,上述表面處理皮膜亦可更包含粗化處理層。特別是,於面(B),表面處理皮膜較佳是包含粗化處理層。粗化處理層是於銅箔基體的表面形成粗化粒子而成。 又,必要時,上述表面處理皮膜亦可包含其他層。 值得注意的是,於面(A)及面(B),各表面處理皮膜的層構成亦可為相同,亦可為不同。 又,表面處理銅箔的表面是指表面處理銅箔的最表面(表裏面),即表面處理皮膜的表面。 In addition, the above-mentioned surface treatment film may further include a roughening treatment layer. In particular, in the surface (B), it is preferable that the surface treatment film includes a roughening treatment layer. The roughening treatment layer is formed by forming roughened particles on the surface of the copper foil substrate. In addition, if necessary, the above-mentioned surface treatment film may also include other layers. It is worth noting that in faces (A) and (B), the layer composition of each surface treatment film may be the same or different. In addition, the surface of the surface-treated copper foil refers to the outermost surface (the surface and the back) of the surface-treated copper foil, that is, the surface of the surface-treated film.

又,上述銅箔基體亦可為電解銅箔,亦可為壓延銅箔,較佳是電解銅箔。銅箔基體的厚度例如是5~210μm,較佳是10~70μm。 又,在銅箔基體為電解銅箔的情形下,表面處理銅箔為電解銅箔,面(A)亦可為從電解銅箔的旋轉滾筒狀陰極(以下簡稱為「滾筒狀陰極」)剝離之面所衍生的面(以下稱為「滾筒面」),亦可為滾筒面的相反側的面(以下稱為「非滾筒面」),但較佳是滾筒面。電解銅箔的製造方法的一例呈現並說明如下。 In addition, the above-mentioned copper foil base may also be an electrolytic copper foil or a rolled copper foil, and is preferably an electrolytic copper foil. The thickness of the copper foil base is, for example, 5 to 210 μm, preferably 10 to 70 μm. In addition, when the copper foil base is an electrolytic copper foil, the surface-treated copper foil may be an electrolytic copper foil, and the surface (A) may be a rotating drum-shaped cathode (hereinafter referred to as "drum-shaped cathode") peeled from the electrolytic copper foil. The surface derived from the surface (hereinafter referred to as the "roller surface") may also be the surface on the opposite side of the roller surface (hereinafter referred to as the "non-roller surface"), but the roller surface is preferred. An example of the manufacturing method of electrolytic copper foil is shown and demonstrated below.

圖1為電解銅箔的製造裝置的示意圖。電極由旋轉滾筒狀的鈦或不鏽鋼所製成的陰極1及呈同心圓狀面對面的覆蓋貴金屬氧化物的電極或鉛電極等不溶性陽極2所構成。在該二電極間,硫酸銅電解液3從裝置下部流入,透過施加電流,滾筒狀陰極的表面析出銅電鍍。滾筒狀陰極1以指定的速度來旋轉,而析出的銅電鍍連續從滾筒狀陰極表面剝離並捲繞成電解銅箔6。在電解銅箔6中,滾筒狀陰極面側稱為滾筒面5,但亦可能一般地稱為光澤面(S面)。又,滾筒面5的相反面稱為非滾筒面4,但亦可能一般地稱為析出面或粗糙面(M面)。Figure 1 is a schematic diagram of an electrolytic copper foil manufacturing device. The electrode is composed of a rotating drum-shaped cathode 1 made of titanium or stainless steel and an insoluble anode 2 such as an electrode covered with a precious metal oxide or a lead electrode facing each other in a concentric circle. Between the two electrodes, the copper sulfate electrolyte 3 flows from the bottom of the device, and by applying electric current, copper plating is deposited on the surface of the drum-shaped cathode. The drum-shaped cathode 1 rotates at a specified speed, and the deposited copper plating is continuously peeled off from the surface of the drum-shaped cathode and wound into an electrolytic copper foil 6 . In the electrolytic copper foil 6 , the drum-shaped cathode surface side is called the drum surface 5 , but it may also be generally called the glossy surface (S surface). In addition, the surface opposite to the roller surface 5 is called the non-roller surface 4, but it may also be generally called a precipitation surface or a rough surface (M surface).

<面(A)> 表面處理銅箔的面(A)為表面處理銅箔的表裏面當中一側的面(表面),即於銅箔基體的表面具有包含防鏽處理層的表面處理皮膜的面。 本發明透過面(A)滿足下述要件(I)及(II),可防止銅箔表面的MD條紋狀變色。 ・要件(I):於前述表面處理銅箔的表面,依據JIS Z 8741:1997所測量的MD的75度鏡面光澤度Gs MD(75°)相對於TD的75度鏡面光澤度Gs TD(75°)的鏡面光澤度比R(75°)[Gs MD(75°)/Gs TD(75°)]為0.90以上且1.60以下。 ・要件(II):於前述表面處理銅箔的表面,由雷射顯微鏡所測量的展開面積比(Sdr)為3.00%以下。 <Side (A)> The surface (A) of the surface-treated copper foil is the surface (surface) on one side of the surface-treated copper foil, that is, the surface of the copper foil base has a surface-treated film including an anti-rust treatment layer. noodle. The transmission surface (A) of the present invention satisfies the following requirements (I) and (II) and can prevent MD stripe-like discoloration on the copper foil surface.・Requirement (I): On the surface of the above-mentioned surface-treated copper foil, the 75-degree specular gloss Gs MD (75°) of MD measured in accordance with JIS Z 8741:1997 relative to the 75-degree specular gloss Gs TD (75) of TD °), the specular gloss ratio R (75°) [Gs MD (75°)/Gs TD (75°)] is 0.90 or more and 1.60 or less.・Requirement (II): The developed area ratio (Sdr) measured by a laser microscope on the surface of the aforementioned surface-treated copper foil is 3.00% or less.

(要件(I)) 本發明著眼於製造過程所進行的處理所引起的銅箔表面的MD的條紋狀凹凸。但是,該些條紋狀的凹凸非常微細,故單獨使用過去的銅箔表面的觀察手法難以適當評價。例如,以雷射顯微鏡或白色干涉顯微鏡等來從垂直方向觀察銅箔表面,故難以正確表示具有非常微細的凹凸的表面的特性。又,掃描型電子顯微鏡(SEM)所產生的剖面觀察的這種直接的二維形狀觀察難以正確定義具有微細的凹凸的表面的三維特性。 因此,只以過去的手法,技術面而言,在銅箔表面的嚴密的評價上有其限制。因此,在本發明中,銅箔表面的評價方法一種手法是根據依據JIS Z 8741:1997所測量的鏡面光澤度界定出銅箔表面的特徴來進行評價。具體而言是根據以下的手法來進行。 (Element (I)) The present invention focuses on the stripe-like unevenness in the MD of the copper foil surface caused by the treatment performed in the manufacturing process. However, these stripe-like unevennesses are very fine, so it is difficult to evaluate them appropriately using conventional copper foil surface observation techniques alone. For example, since the copper foil surface is observed from the vertical direction using a laser microscope or a white interference microscope, it is difficult to accurately express the characteristics of a surface having very fine unevenness. In addition, it is difficult to accurately define the three-dimensional characteristics of a surface with fine unevenness through direct two-dimensional shape observation such as cross-sectional observation using a scanning electron microscope (SEM). Therefore, only conventional methods have limitations in strictly evaluating the copper foil surface from a technical perspective. Therefore, in the present invention, one method of evaluating the copper foil surface is to define the characteristics of the copper foil surface based on the specular glossiness measured in accordance with JIS Z 8741:1997. Specifically, it is carried out according to the following methods.

通常,鏡面光澤度的測量一般是從一方向以單一受光角來測量並評價。然而,本發明的表面處理銅箔的表面非常平滑,故從一方向來測量難以充分評價其表面形狀。 因此,本發明人等著眼於從MD及TD二方向使用指定的受光角來測量鏡面光澤度,算出其比,據此評價銅箔的表面形狀的各向異性的方法。 但是,測量鏡面光澤度時的受光角至今為止一般是根據60度或85度來評價,但在此種情形下難以適當評價銅箔的表面形狀的各向異性。例如,在受光角為60度的情形下,光的入射角較小,故針對如同本發明的銅箔的表面的非常平滑的表面,無法適當評價。又,在受光角為85度的情形下,表面形狀的敏感度太高,故從二方向測量的鏡面光澤度的差值較小,算出並評價來自二方向的鏡面光澤度比並不適當。 因此,本發明人等發現到:著眼於測量鏡面光澤度時的受光角為75度,以該受光角來測量MD及TD二方向的鏡面光澤度,算出其比並評價,據此,針對至今為止難以適當評價的非常平滑的銅箔表面,可適當評價其表面形狀的各向異性。 Usually, the measurement of specular gloss is generally measured and evaluated from one direction at a single light receiving angle. However, the surface of the surface-treated copper foil of the present invention is very smooth, so it is difficult to fully evaluate the surface shape when measured from one direction. Therefore, the present inventors focused on a method of measuring the specular glossiness from both the MD and TD directions using specified light receiving angles, calculating the ratio, and evaluating the anisotropy of the surface shape of the copper foil based on this. However, the light receiving angle when measuring specular gloss has hitherto been generally evaluated based on 60 degrees or 85 degrees. However, in this case, it is difficult to appropriately evaluate the anisotropy of the surface shape of the copper foil. For example, in the case where the light receiving angle is 60 degrees, the incident angle of light is small, so a very smooth surface such as the surface of the copper foil of the present invention cannot be appropriately evaluated. In addition, when the light receiving angle is 85 degrees, the sensitivity of the surface shape is too high, so the difference in specular gloss measured from two directions is small, and it is not appropriate to calculate and evaluate the specular gloss ratio from two directions. Therefore, the present inventors found that focusing on the light-receiving angle when measuring specular glossiness is 75 degrees, measuring the specular glossiness in both directions of MD and TD at this light-receiving angle, calculating and evaluating the ratios, and based on this, the present inventors have found that The anisotropy of the surface shape of a very smooth copper foil surface that has been difficult to appropriately evaluate until now can be appropriately evaluated.

面(A)於表面處理銅箔的表面,依據JIS Z 8741:1997所測量的MD的75度鏡面光澤度Gs MD(75°)相對於TD的75度鏡面光澤度Gs TD(75°)的鏡面光澤度比R(75°)[Gs MD(75°)/Gs TD(75°)]為0.90以上且1.60以下。可認為鏡面光澤度比R(75°)表示的是銅箔表面的表面形狀的各向異性。若鏡面光澤度比R(75°)為上述範圍外,則在長期保存,特別是高濕環境下,容易發生MD條紋狀變色。鏡面光澤度比R(75°)較佳是0.95以上且1.50以下,更佳是0.95以上且1.40以下,再更佳是0.95以上且1.30以下。 值得注意的是,TD的75度鏡面光澤度Gs TD(75°)例如是30%以上且250%以下,較佳是80%以上且220%以下。又,MD的75度鏡面光澤度Gs MD(75°)例如是80%以上且300%以下,較佳是150%以上且250%以下。 值得注意的是,上述各鏡面光澤度Gs可透過實施例所記載的方法來測量。 Surface (A) On the surface of the surface-treated copper foil, the 75-degree specular gloss Gs MD (75°) of MD measured in accordance with JIS Z 8741:1997 relative to the 75-degree specular gloss Gs TD (75°) of TD The specular gloss ratio R (75°) [Gs MD (75°)/Gs TD (75°)] is 0.90 or more and 1.60 or less. It is considered that the specular gloss ratio R (75°) represents the anisotropy of the surface shape of the copper foil surface. If the specular gloss ratio R (75°) is outside the above range, MD stripe discoloration is likely to occur during long-term storage, especially in a high-humidity environment. The specular gloss ratio R (75°) is preferably 0.95 or more and 1.50 or less, more preferably 0.95 or more and 1.40 or less, still more preferably 0.95 or more and 1.30 or less. It is worth noting that the 75-degree specular gloss Gs TD (75°) of TD is, for example, 30% or more and 250% or less, and preferably 80% or more and 220% or less. Moreover, the 75-degree specular gloss Gs MD (75°) of MD is, for example, 80% or more and 300% or less, preferably 150% or more and 250% or less. It is worth noting that each of the above specular gloss Gs can be measured by the method described in the embodiment.

(要件(II)) 如上所述,面(A)為非常平滑的面。這種面(A)於表面處理銅箔的表面由雷射顯微鏡所測量的展開面積比(Sdr)為3.00%以下。若展開面積比(Sdr)為上述範圍外,則在長期保存,特別是高濕環境下,容易發生MD條紋狀變色。展開面積比(Sdr)較佳是1.50%以下,更佳是1.00%以下。值得注意的是,下限例如是0.01%以上。 值得注意的是,展開面積比(Sdr)可透過實施例所記載的方法來測量。 (Element (II)) As mentioned above, surface (A) is a very smooth surface. The developed area ratio (Sdr) of this surface (A) on the surface of the surface-treated copper foil measured by a laser microscope is 3.00% or less. If the developed area ratio (Sdr) is outside the above range, MD stripe discoloration is likely to occur during long-term storage, especially in a high-humidity environment. The development area ratio (Sdr) is preferably 1.50% or less, more preferably 1.00% or less. It is worth noting that the lower limit is, for example, 0.01% or more. It is worth noting that the developed area ratio (Sdr) can be measured by the method described in the embodiment.

滿足上述的表面形狀的面(A)較佳是於銅箔基體的表面施加平坦化處理所製成的面。透過施加該種處理,容易將面(A)的表面形狀控制於所需的範圍。The surface (A) that satisfies the above-mentioned surface shape is preferably a surface obtained by subjecting the surface of the copper foil base to a planarization process. By applying this kind of treatment, the surface shape of surface (A) can be easily controlled within a desired range.

又,面(A)為具有包含防鏽處理層的表面處理皮膜的面。防鏽處理層可透過金屬防鏽處理或使用包含Si的有機化合物等的有機防鏽處理來形成。In addition, the surface (A) is a surface having a surface treatment film including an anti-rust treatment layer. The anti-rust treatment layer can be formed by metal anti-rust treatment or organic anti-rust treatment using an organic compound containing Si or the like.

至少在上述防鏽處理層為金屬防鏽處理所產生的處理層的情形下,防鏽處理層較佳是包含Zn及Cr的至少一者。 在防鏽處理層包含Zn及Cr的至少一者的情形下,於面(A),Zn及Cr附著量可例如分別設定成1.000mg/dm 2以下。又,從有效抑制銅箔表面的變色的觀點觀之,於面(A),Zn附著量較佳是0.001mg/dm 2以上且0.800mg/dm 2以下,或Cr附著量較佳是0.001mg/dm 2以上且0.500mg/dm 2以下。 在此,Zn附著量,從更有效抑制銅箔表面的變色的觀點觀之,更佳是0.005mg/dm 2以上且0.800mg/dm 2以下。又,Cr附著量,從更有效抑制銅箔表面的變色的觀點觀之,更佳是0.005mg/dm 2以上且0.500mg/dm 2以下。此外,從更有效抑制銅箔表面的變色的觀點觀之,防鏽處理層較佳是包含Zn及Cr兩者,面(A)的Zn及Cr各自的附著量較佳是分別在上述範圍內。 At least in the case where the above-mentioned anti-rust treatment layer is a treatment layer produced by metal anti-rust treatment, the anti-rust treatment layer preferably contains at least one of Zn and Cr. When the anti-rust treatment layer contains at least one of Zn and Cr, the adhesion amounts of Zn and Cr on the surface (A) can be set to 1.000 mg/dm 2 or less, for example. Moreover, from the viewpoint of effectively suppressing discoloration of the copper foil surface, the Zn adhesion amount on the surface (A) is preferably 0.001 mg/dm 2 or more and 0.800 mg/dm 2 or less, or the Cr adhesion amount is preferably 0.001 mg. /dm 2 or more and 0.500mg/dm 2 or less. Here, from the viewpoint of more effectively suppressing discoloration of the copper foil surface, the Zn adhesion amount is more preferably 0.005 mg/dm 2 or more and 0.800 mg/dm 2 or less. Moreover, from the viewpoint of more effectively suppressing discoloration of the copper foil surface, the Cr adhesion amount is more preferably 0.005 mg/dm 2 or more and 0.500 mg/dm 2 or less. In addition, from the viewpoint of more effectively suppressing the discoloration of the copper foil surface, the anti-rust treatment layer preferably contains both Zn and Cr, and the adhesion amounts of Zn and Cr on the surface (A) are preferably within the above ranges. .

又,至少在上述防鏽處理層為有機防鏽處理所產生的處理層的情形下,防鏽處理層較佳是包含Si(矽)。 在防鏽處理層包含Si的情形下,於面(A),Si附著量可例如設定成1.000mg/dm 2以下。又,從有效抑制銅箔表面的變色的觀點觀之,於面(A),Si附著量較佳是0.001mg/dm 2以上且0.500mg/dm 2以下,更佳是0.003mg/dm 2以上且0.500mg/dm 2以下。 Furthermore, at least when the anti-rust treatment layer is a treatment layer produced by an organic anti-rust treatment, the anti-rust treatment layer preferably contains Si (silicon). When the anti-rust treatment layer contains Si, the Si adhesion amount on the surface (A) can be set to 1.000 mg/dm 2 or less, for example. Moreover, from the viewpoint of effectively suppressing discoloration of the copper foil surface, the Si adhesion amount on the surface (A) is preferably 0.001 mg/dm 2 or more and 0.500 mg/dm 2 or less, more preferably 0.003 mg/dm 2 or more And less than 0.500mg/ dm2 .

此外,從提升防鏽效果的觀點觀之,上述防鏽處理層亦可包含金屬防鏽處理所產生的處理層及有機防鏽處理所產生的處理層兩者,在該種情形下,表面處理皮膜較佳是包括Zn及Cr的至少一者及Si。此時,面(A)的Zn、Cr、及Si各自的附著量較佳是分別在上述範圍內。In addition, from the perspective of improving the anti-rust effect, the above-mentioned anti-rust treatment layer may also include both a treatment layer produced by metal anti-rust treatment and a treatment layer produced by organic anti-rust treatment. In this case, the surface treatment The film preferably contains at least one of Zn and Cr and Si. At this time, it is preferable that the adhesion amounts of Zn, Cr, and Si on the surface (A) are within the above ranges.

又,從無Cr的觀點觀之,防鏽處理層較佳是主要是使用有機防鏽劑來形成,在該種情形下,於面(A),表面處理皮膜較佳是包含Si,更佳是實質上不包含Cr。具體而言,於面(A),Si附著量較佳是在上述範圍內,Cr附著量更佳是未達0.001mg/dm 2Furthermore, from the viewpoint of being free of Cr, it is preferable that the anti-rust treatment layer is mainly formed using an organic anti-rust agent. In this case, in face (A), the surface treatment film preferably contains Si, and more preferably It does not contain Cr substantially. Specifically, in the surface (A), the Si adhesion amount is preferably within the above range, and the Cr adhesion amount is more preferably less than 0.001 mg/dm 2 .

值得注意的是,面(A)的各成分的附著量可透過實施例所記載的方法來測量。It is worth noting that the adhesion amount of each component of surface (A) can be measured by the method described in the examples.

<面(B)> 表面處理銅箔的面(B)為表面處理銅箔的表裏面當中相對於上述面(A)的另一側的面(裏面)。 <Side (B)> The surface (B) of the surface-treated copper foil is the other surface (back) to the above-mentioned surface (A) among the front and back surfaces of the surface-treated copper foil.

在本發明的表面處理銅箔中,面(B)的表面形狀可適當調整,例如,面(B)較佳是於表面處理銅箔的表面,依據JIS Z 8741:1997所測量的MD的75度鏡面光澤度Gs MD(75°)相對於TD的75度鏡面光澤度Gs TD(75°)的鏡面光澤度比R(75°)[Gs MD(75°)/Gs TD(75°)]為0.50以上且1.60以下,由雷射顯微鏡所測量的展開面積比(Sdr)為310%以下。 又,從進一步抑制銅箔表面的變色的觀點觀之,面(B)更佳是滿足下述要件(III)及(IV)。 In the surface-treated copper foil of the present invention, the surface shape of the surface (B) can be adjusted appropriately. For example, the surface (B) is preferably on the surface of the surface-treated copper foil, and the MD measured according to JIS Z 8741:1997 is 75 Specular gloss ratio R (75°) of 75-degree specular gloss Gs MD (75°) relative to TD Specular gloss Gs TD (75°) [Gs MD (75°)/Gs TD (75°)] is 0.50 or more and 1.60 or less, and the developed area ratio (Sdr) measured by a laser microscope is 310% or less. Moreover, from the viewpoint of further suppressing discoloration of the copper foil surface, surface (B) more preferably satisfies the following requirements (III) and (IV).

通常,銅箔製品一般是製造、保存成卷狀。在捲繞成卷狀的狀態下,面(A)與面(B)配置成面對面。在以該種狀態來保存銅箔的情形下,根據面(B)的表面形狀,可能與面(A)產生摩擦。其結果,即使於面(A)施加金屬防鏽處理或有機防鏽處理,因與面(B)接觸,防鏽處理層仍可能被部分刮除,銅會露出(摩擦不均),在長期保存中發生氧化,於銅箔表面產生變色。Usually, copper foil products are generally manufactured and stored in roll form. In the state of being wound into a roll, the surface (A) and the surface (B) are arranged to face each other. When the copper foil is stored in this state, friction may occur with the surface (A) depending on the surface shape of the surface (B). As a result, even if metal anti-rust treatment or organic anti-rust treatment is applied to surface (A), due to contact with surface (B), the anti-rust treatment layer may still be partially scraped off, and the copper will be exposed (uneven friction). In the long term, Oxidation occurs during storage, causing discoloration on the surface of the copper foil.

本發明人等針對該種銅箔表面的變色進行努力研究的結果,發現到:透過面(B)滿足下述要件(III)及(IV),可減少從面(B)朝向面(A)的摩擦,可防止與面(A)摩擦不均所引起的變色。As a result of diligent research on the discoloration on the surface of this type of copper foil, the inventors found that the transmission surface (B) satisfies the following requirements (III) and (IV) and can reduce the amount of discoloration from surface (B) to surface (A). The friction can prevent discoloration caused by uneven friction with surface (A).

亦即,本發明從進一步抑制銅箔表面的變色的觀點觀之,面(B)較佳是滿足下述要件(III)及(IV)。 ・要件(III):於前述表面處理銅箔的表面,依據JIS Z 8741:1997所測量的MD的75度鏡面光澤度Gs MD(75°)相對於TD的75度鏡面光澤度Gs TD(75°)的鏡面光澤度比R(75°)[Gs MD(75°)/Gs TD(75°)]為0.60以上且1.50以下。 ・要件(IV):於前述表面處理銅箔的表面,由雷射顯微鏡所測量的展開面積比(Sdr)為300%以下。 That is, in the present invention, from the viewpoint of further suppressing discoloration of the copper foil surface, surface (B) preferably satisfies the following requirements (III) and (IV).・Requirement (III): On the surface of the above-mentioned surface-treated copper foil, the 75-degree specular gloss Gs MD (75°) of MD measured in accordance with JIS Z 8741:1997 relative to the 75-degree specular gloss Gs TD (75) of TD °), the specular gloss ratio R (75°) [Gs MD (75°)/Gs TD (75°)] is 0.60 or more and 1.50 or less.・Requirement (IV): The developed area ratio (Sdr) measured by a laser microscope on the surface of the aforementioned surface-treated copper foil is 300% or less.

(要件(III)) 面(B)於表面處理銅箔的表面,依據JIS Z 8741:1997所測量的MD的75度鏡面光澤度Gs MD(75°)相對於TD的75度鏡面光澤度Gs TD(75°)的鏡面光澤度比R(75°)[Gs MD(75°)/Gs TD(75°)]較佳是0.60以上且1.50以下。若鏡面光澤度比R(75°)為上述範圍內,則可有效抑制與面(A)摩擦不均所引起的變色。鏡面光澤度比R(75°)更佳是0.70以上且1.40以下,再更佳是0.80以上且1.30以下。 值得注意的是,TD的75度鏡面光澤度Gs TD(75°)例如是0.5%以上且250%以下,較佳是10%以上且220%以下。又,MD的75度鏡面光澤度Gs MD(75°)例如是0.5%以上且300%以下,較佳是10%以上且250%以下。 值得注意的是,上述各鏡面光澤度Gs可透過實施例所記載的方法來測量。 (Requirement (III)) On the surface of the surface (B) of the surface-treated copper foil, the 75-degree specular gloss Gs of MD measured in accordance with JIS Z 8741:1997 MD (75°) The 75-degree specular gloss Gs of MD (75°) relative to TD The specular gloss ratio R (75°) of TD (75°) [Gs MD (75°)/Gs TD (75°)] is preferably 0.60 or more and 1.50 or less. If the specular gloss ratio R (75°) is within the above range, discoloration caused by uneven friction with surface (A) can be effectively suppressed. The specular gloss ratio R (75°) is preferably 0.70 or more and 1.40 or less, and still more preferably 0.80 or more and 1.30 or less. It is worth noting that the 75-degree specular gloss Gs TD (75°) of TD is, for example, 0.5% or more and 250% or less, and preferably 10% or more and 220% or less. Moreover, the 75-degree specular gloss Gs MD (75°) of MD is, for example, 0.5% or more and 300% or less, and preferably 10% or more and 250% or less. It is worth noting that each of the above specular gloss Gs can be measured by the method described in the embodiment.

(要件(IV)) 又,面(B)亦較佳是平滑面。面(B)於表面處理銅箔的表面由雷射顯微鏡所測量的展開面積比(Sdr)較佳是300%以下。若展開面積比(Sdr)為300%以下,則可有效抑制與面(A)摩擦不均所引起的變色。又,展開面積比(Sdr)較佳是120%以下,更佳是10.0%以下,再更佳是3.00%以下。特別是,透過將展開面積比(Sdr)設定成較佳是120%以下,更佳是3.00%以下,在用於印刷電路板用途的情形下,可進一步提升傳遞特性。又,透過將展開面積比(Sdr)設定成3.00%以下,可使面(A)及面(B)雙面皆為非常平滑的表面處理銅箔。又,下限例如是0.01%以上。 值得注意的是,展開面積比(Sdr)可透過實施例所記載的方法來測量。 (Element (IV)) Moreover, it is also preferable that surface (B) is a smooth surface. The developed area ratio (Sdr) of the surface (B) on the surface of the surface-treated copper foil measured by a laser microscope is preferably 300% or less. If the developed area ratio (Sdr) is 300% or less, discoloration caused by uneven friction with surface (A) can be effectively suppressed. Moreover, the development area ratio (Sdr) is preferably 120% or less, more preferably 10.0% or less, and still more preferably 3.00% or less. In particular, by setting the developed area ratio (Sdr) to preferably 120% or less, more preferably 3.00% or less, the transfer characteristics can be further improved when used for printed circuit boards. In addition, by setting the developed area ratio (Sdr) to 3.00% or less, both sides (A) and (B) can be made into very smooth surface-treated copper foil. Moreover, the lower limit is, for example, 0.01% or more. It is worth noting that the developed area ratio (Sdr) can be measured by the method described in the embodiment.

<表面處理銅箔的製造方法> 接著,針對本發明的表面處理銅箔的較佳製造方法,說明其中一例。 <Manufacturing method of surface-treated copper foil> Next, one example of a preferable manufacturing method of the surface-treated copper foil of this invention is demonstrated.

較佳是於對應於面(A)之側的銅箔基體的表面施加平坦化處理,作為針對銅箔基體(原箔)的後處理。例如透過在下述條件下施加平坦化處理,可使面(A)的表面形狀滿足上述要件(I)及(II)。It is preferable to apply planarization treatment on the surface of the copper foil base body corresponding to the side (A) as a post-processing for the copper foil base body (original foil). For example, by applying planarization treatment under the following conditions, the surface shape of surface (A) can be made to satisfy the above requirements (I) and (II).

(銅箔基體) 銅箔基體較佳是使用具有不存在粗大的凹凸的平滑且具有光澤的表面的電解銅箔或壓延銅箔。其中,基於生產性或成本的觀點,較佳是使用電解銅箔,特別是對應於面(A)的面較佳是使用電解銅箔的滾筒面。從獲得適合形成滿足要件(I)及(II)的面(A)的滾筒面形狀的觀點觀之,用於電解銅箔製造的滾筒狀陰極表面較佳是以#1000號~#2500號的拋光膏來研磨。 (copper foil base) It is preferable to use an electrolytic copper foil or a rolled copper foil which has a smooth and glossy surface without coarse unevenness as a copper foil base. Among them, from the viewpoint of productivity or cost, it is preferable to use electrolytic copper foil. In particular, it is preferable to use the drum surface of electrolytic copper foil for the surface corresponding to the surface (A). From the viewpoint of obtaining a roll surface shape suitable for forming surface (A) that satisfies requirements (I) and (II), the roll-shaped cathode surface used for electrolytic copper foil production is preferably #1000 to #2500. Polishing paste for grinding.

〔針對對應於面(A)的面的處理〕 從使面(A)的表面形狀滿足上述要件(I)及(II)的觀點觀之,較佳是於對應於面(A)的銅箔基體表面施加平坦化處理。又,平坦化處理更佳是於防鏽處理前進行,更佳是以〔A1〕平坦化處理及〔A2〕防鏽處理的順序來進行。 [Processing for the face corresponding to face (A)] From the viewpoint of making the surface shape of the surface (A) satisfy the above-mentioned requirements (I) and (II), it is preferable to apply a planarization process to the surface of the copper foil base corresponding to the surface (A). Moreover, it is more preferable that the flattening process is performed before the rust-proofing process, and it is more preferable that it is performed in the order of [A1] flattening process and [A2] rust-proofing process.

〔A1〕平坦化處理 平坦化處理包括使用焦磷酸銅液的直流陽極溶解等處理。以使用焦磷酸銅液的直流陽極溶解為例,適合的處理條件例示如下。值得注意的是,下述條件為平坦化處理的較佳的一例,在不妨礙本發明的效果的範圍內,亦可進行其他處理,必要時,亦可適當變更、調整添加劑的種類或數量、電解條件等。 [A1] Flattening treatment Planarization treatment includes DC anode dissolution using copper pyrophosphate solution. Taking DC anode dissolution using copper pyrophosphate liquid as an example, suitable treatment conditions are illustrated below. It is worth noting that the following conditions are a preferred example of the flattening process. Other processes can also be performed within the scope that does not hinder the effects of the present invention. If necessary, the type or amount of additives can be appropriately changed or adjusted. Electrolysis conditions, etc.

・使用焦磷酸銅液的直流陽極溶解 較佳是使用具有下述電解液組成的焦磷酸銅水溶液,在下述條件下進行直流陽極溶解。透過滿足下述條件,可使面(A)的表面形狀滿足上述要件(I)及(II)。 <電解液組成(焦磷酸銅水溶液)> 三水焦磷酸銅:70~120g/L 焦磷酸鉀:300~400g/L 氨:0.25~1.3g/L 乙基黃原酸鉀:10~30mg/L <陰極及陽極> 陰極:無氧銅 陽極:對應於面(A)的銅箔基體表面 <電解條件> 液溫:15~55℃ 電流密度:5~65A/dm 2溶解時間:3~80秒 電荷密度:30.0~1800.0C/dm 2 ・For DC anode dissolution using a copper pyrophosphate solution, it is preferable to use a copper pyrophosphate aqueous solution having the following electrolyte composition and perform DC anode dissolution under the following conditions. By satisfying the following conditions, the surface shape of surface (A) can satisfy the above requirements (I) and (II). <Electrolyte composition (copper pyrophosphate aqueous solution)> Copper pyrophosphate trihydrate: 70~120g/L Potassium pyrophosphate: 300~400g/L Ammonia: 0.25~1.3g/L Potassium ethyl xanthate: 10~30mg/ L <Cathode and Anode> Cathode: Oxygen-free copper Anode: Copper foil base surface corresponding to surface (A) <Electrolysis conditions> Liquid temperature: 15~55℃ Current density: 5~65A/dm 2 Dissolution time: 3~80 Second charge density: 30.0~1800.0C/dm 2

〔A2〕防鏽處理 防鏽處理較佳是施加於上述平坦化處理後的面(A)。防鏽處理亦可為金屬防鏽處理及有機防鏽處理的任一者。各適合的處理條件例示如下。值得注意的是,下述條件為較佳的一例,在不妨礙本發明的效果的範圍內,必要時,可適當變更、調整添加劑的種類或數量、電解條件。 〔A2〕Anti-rust treatment The anti-rust treatment is preferably applied to the surface (A) after the above-mentioned flattening treatment. The anti-rust treatment may be either metal anti-rust treatment or organic anti-rust treatment. Examples of each suitable processing condition are shown below. It is worth noting that the following conditions are a preferred example, and the type or amount of additives and electrolysis conditions can be appropriately changed and adjusted if necessary within the scope that does not hinder the effects of the present invention.

・金屬防鏽處理 金屬防鏽處理包括Ni、Zn、及Cr等所產生的金屬電鍍處理,其中適合的是Zn電鍍處理及Cr電鍍處理。 該種金屬防鏽處理可根據表面處理銅箔的用途或目的的特性,適當選擇指定的金屬電鍍處理,必要時,透過組合,形成具有所需的構成的金屬防鏽處理層。 金屬防鏽處理層亦可為單層,但亦可為二層以上的多層。多層的具體例包括從銅箔基體側起具有包含Zn的層及包含Cr的層的二層的構成或包含Ni的層、包含Zn的層、及包含Cr的層的三層的構成的金屬防鏽處理層。 ・Metal anti-rust treatment Metal anti-rust treatment includes metal plating treatment produced by Ni, Zn, Cr, etc. Among them, Zn electroplating treatment and Cr electroplating treatment are suitable. This kind of metal anti-rust treatment can appropriately select the specified metal plating treatment according to the use or purpose of the surface-treated copper foil. If necessary, through combination, a metal anti-rust treatment layer with the required composition can be formed. The metal anti-rust treatment layer can also be a single layer, or it can also be multiple layers of two or more layers. Specific examples of the multilayer include a metal barrier having a two-layer structure of a layer containing Zn and a layer containing Cr, or a three-layer structure of a layer containing Ni, a layer containing Zn, and a layer containing Cr. Rust treatment layer.

包含Zn的層較佳是在必須進一步提升耐熱性的情形下形成。包含Zn的層(耐熱層)較佳是由例如鋅或包含鋅的合金,亦即,選自鋅(Zn)-錫(Sn)、鋅(Zn)-鎳(Ni)、鋅(Zn)-鈷(Co)、鋅(Zn)-銅(Cu)、鋅(Zn)-鉻(Cr)、及鋅(Zn)-釩(V)中的至少1種包含鋅的合金所形成。The layer containing Zn is preferably formed when heat resistance must be further improved. The Zn-containing layer (heat-resistant layer) is preferably made of, for example, zinc or a zinc-containing alloy, that is, selected from zinc (Zn)-tin (Sn), zinc (Zn)-nickel (Ni), zinc (Zn)- It is formed of at least one alloy containing zinc among cobalt (Co), zinc (Zn)-copper (Cu), zinc (Zn)-chromium (Cr), and zinc (Zn)-vanadium (V).

包含Cr的層較佳是在必須進一步提升耐蝕性的情形下形成。包含Cr的層(耐蝕層)例如包括透過Cr電鍍所形成的鉻層及透過鉻酸鹽處理所形成的鉻酸鹽層。The layer containing Cr is preferably formed when corrosion resistance must be further improved. The layer containing Cr (corrosion-resistant layer) includes, for example, a chromium layer formed by Cr plating and a chromate layer formed by chromate treatment.

例如在銅箔基體或粗化處理層中的銅(Cu)可能擴散至樹脂基材側,發生銅害,而降低密合性的情形下,包含Ni的層較佳是形成在銅箔基體或粗化處理層與矽烷偶聯劑層之間。包含Ni的層(下地層)較佳是由選自鎳(Ni)、鎳(Ni)-磷(P)、鎳(Ni)-鋅(Zn)中的至少1種所形成。For example, in the case where copper (Cu) in the copper foil base or roughened layer may diffuse to the resin base material side, causing copper damage and reducing adhesion, the layer containing Ni is preferably formed on the copper foil base or roughened layer. Between the roughening treatment layer and the silane coupling agent layer. The layer containing Ni (lower layer) is preferably formed of at least one selected from the group consisting of nickel (Ni), nickel (Ni)-phosphorus (P), and nickel (Ni)-zinc (Zn).

・有機防鏽處理 有機防鏽處理包括使用有機防鏽劑的防鏽處理,但具體而言,適合使用包含Si的有機化合物的防鏽處理。 包含Si的有機化合物較佳是包含苯乙烯基矽烷、氨基矽烷、乙烯基矽烷、甲基丙烯酸矽烷、丙烯酸矽烷、苯乙烯基矽烷、脲基矽烷、巰基矽烷、硫化矽烷、咪唑矽烷、及異氰酸酯矽烷的任1種以上的矽烷偶聯劑。 ・Organic anti-rust treatment The organic anti-rust treatment includes anti-rust treatment using an organic anti-rust agent, but specifically, anti-rust treatment using an organic compound containing Si is suitable. The organic compound containing Si preferably contains styrylsilane, aminosilane, vinylsilane, methacrylic silane, acrylic silane, styrylsilane, ureidosilane, mercaptosilane, sulfide silane, imidazole silane, and isocyanate silane Any one or more silane coupling agents.

又,透過有機防鏽處理來形成有機防鏽處理層的方法例如包括於上述平坦化處理後的面(A),直接或藉由金屬防鏽處理層,塗布有機化合物溶液後,加以風乾(自然乾燥)或加熱乾燥而形成的方法。塗布的有機化合物溶液是透過溶液中的溶劑(例如水)蒸發而形成有機防鏽處理層。值得注意的是,在包含Si的有機化合物為矽烷偶聯劑的情形下,適合在50~180℃下加熱乾燥,因為可促進矽烷偶聯劑與銅箔的反應。In addition, the method of forming an organic anti-rust treatment layer through organic anti-rust treatment includes, for example, applying an organic compound solution directly or through a metal anti-rust treatment layer on the surface (A) after the above-mentioned planarization treatment, and then air-drying (naturally) drying) or heat drying. The applied organic compound solution forms an organic anti-rust treatment layer through the evaporation of the solvent (such as water) in the solution. It is worth noting that when the organic compound containing Si is a silane coupling agent, heating and drying at 50 to 180°C is suitable because the reaction between the silane coupling agent and the copper foil can be accelerated.

值得注意的是,上述防鏽處理層的厚度非常薄,故不影響表面處理銅箔的表面形狀。因此,表面處理銅箔的表面形狀實質上由防鏽處理前的形狀,例如上述平坦化處理後的面(A)的形狀所決定。It is worth noting that the thickness of the above-mentioned anti-rust treatment layer is very thin, so it does not affect the surface shape of the surface-treated copper foil. Therefore, the surface shape of the surface-treated copper foil is essentially determined by the shape before anti-rust treatment, for example, the shape of the surface (A) after the above-described planarization treatment.

〔針對對應於面(B)的面的處理〕 於對應於面(B)的銅箔基體表面較佳是施加防鏽處理,必要時,於防鏽處理前亦可施加粗化處理或平坦化處理。 防鏽處理及平坦化處理,可在針對對應於面(A)的面的處理中,在例示的條件下進行。 又,粗化處理的適合的處理條件例示如下,但下述條件是較佳的一例,在不妨礙本發明的效果的範圍內,必要時,可適當變更、調整添加劑的種類或數量、電解條件。又,在進行粗化處理的情形下,較佳是以〔B1〕粗化處理及〔B2〕防鏽處理的順序來進行。 [Processing for the face corresponding to face (B)] It is preferable to apply anti-rust treatment to the surface of the copper foil base corresponding to surface (B). If necessary, roughening treatment or flattening treatment can also be applied before anti-rust treatment. The anti-rust treatment and the flattening treatment can be performed under the conditions illustrated in the treatment for the surface corresponding to surface (A). In addition, the suitable treatment conditions for the roughening treatment are exemplified as follows, but the following conditions are a preferred example, and the type or amount of additives and electrolysis conditions can be appropriately changed and adjusted if necessary within the scope that does not hinder the effects of the present invention. . Moreover, when performing a roughening process, it is preferable to perform it in the order of [B1] roughening process and [B2] rust-proofing process.

〔B1〕粗化處理 粗化處理較佳是針對對應於面(B)的銅箔基體表面,以卷對卷的方式來進行粗化電鍍處理及固定電鍍處理2階段的電鍍處理,形成粗化處理層。粗化電鍍處理及固定電鍍處理的適合的條件如下所示。值得注意的是,透過滿足下述條件,可將面(B)的表面形狀控制成上述適合的形狀。 〔B1〕Roughening treatment The roughening treatment is preferably performed on the surface of the copper foil base corresponding to the surface (B) in a roll-to-roll manner, using a two-stage electroplating process of roughening electroplating treatment and fixed electroplating treatment to form a roughened treatment layer. Suitable conditions for roughening plating treatment and fixing plating treatment are as follows. It is worth noting that by satisfying the following conditions, the surface shape of surface (B) can be controlled to the above-mentioned appropriate shape.

・粗化電鍍處理 較佳是使用下述硫酸銅水溶液,在下述條件下進行電鍍處理。 <電解液組成(硫酸銅水溶液)> 五水硫酸銅:由銅(原子)換算,40~80g/L 硫酸:80~200g/L <電解條件> 液溫:15~35℃ 電流密度:5~90A/dm 2處理時間:0.5~50秒 電荷密度:10~500C/dm 2處理速度:8~20m/分 ・For roughening plating treatment, it is preferable to use the following copper sulfate aqueous solution and perform plating treatment under the following conditions. <Electrolyte composition (copper sulfate aqueous solution)> Copper sulfate pentahydrate: converted from copper (atom), 40 to 80g/L Sulfuric acid: 80 to 200g/L <Electrolysis conditions> Liquid temperature: 15 to 35°C Current density: 5 to 90A/dm 2 processing time: 0.5~50 seconds Charge density: 10~500C/dm 2 processing speed: 8~20m/min

・固定電鍍處理 較佳是使用下述硫酸銅水溶液,在下述條件下進行電鍍處理。 <電解液組成(硫酸銅水溶液)> 五水硫酸銅:由銅(原子)換算,70~150g/L 硫酸:100~200g/L <電解條件> 液溫:40~60℃ 電流密度:1~10A/dm 2處理時間:2~20秒 電荷密度:2~100C/dm 2處理速度:8~20m/分 ・For fixed plating treatment, it is preferable to use the following copper sulfate aqueous solution and perform plating treatment under the following conditions. <Electrolyte composition (copper sulfate aqueous solution)> Copper sulfate pentahydrate: converted from copper (atom), 70~150g/L Sulfuric acid: 100~200g/L <Electrolysis conditions> Liquid temperature: 40~60℃ Current density: 1~ 10A/dm 2 processing time: 2~20 seconds Charge density: 2~100C/dm 2 processing speed: 8~20m/min

〔B2〕防鏽處理 防鏽處理可在針對對應於面(A)的面的處理中例示的條件下進行。 具體而言,於上述粗化處理後的面(B),以Ni、Zn、Cr的順序施加金屬電鍍,形成金屬防鏽處理層後,較佳是進一步透過包含Si的有機化合物來形成有機防鏽處理層。 〔B2〕Anti-rust treatment The anti-rust treatment can be performed under the conditions illustrated in the treatment for the surface corresponding to surface (A). Specifically, on the surface (B) after the above-mentioned roughening treatment, metal plating is applied in the order of Ni, Zn, and Cr to form a metal anti-rust treatment layer, and then it is preferable to further form an organic anti-rust layer through an organic compound containing Si. Rust treatment layer.

[銅箔卷] 本發明的表面處理銅箔特別是適合製造成卷狀來捲繞並保存的情形。 本發明的表面處理銅箔所製成的銅箔卷是將上述面(A)作為外側,在上述面(A)與上述面(B)接觸的狀態下捲繞而成。 本發明的銅箔卷透過將表面處理銅箔保存成卷狀,可減少保存面積,同時,於卷的內側,可最小化外界空氣對於銅箔表面的影響,故適合銅箔的長期保存。 [Copper Foil Roll] The surface-treated copper foil of the present invention is particularly suitable when it is produced in a roll shape, wound up, and stored. The copper foil roll made of the surface-treated copper foil of the present invention is wound with the above-mentioned surface (A) as the outer side and the above-mentioned surface (A) and the above-mentioned surface (B) in contact. The copper foil roll of the present invention can reduce the storage area by storing the surface-treated copper foil in a roll shape. At the same time, the influence of outside air on the surface of the copper foil can be minimized on the inside of the roll, so it is suitable for long-term storage of copper foil.

又,在過去的銅箔卷中,銅箔的表面與裏面配置成面對面時,根據裏面的狀態,可能與表面產生摩擦。其結果,即使於表面施加金屬防鏽處理或有機防鏽處理,因與裏面接觸,防鏽處理層仍可能會被刮除,銅會露出,在保存中發生氧化,於銅箔表面產生變色。 但是,本發明的銅箔卷特別是透過上述面(B)滿足上述要件(III)及(IV),可減少從上述面(B)朝向上述面(A)的摩擦,可防止與上述面(A)的摩擦不均所引起的變色。 Furthermore, in conventional copper foil rolls, when the surface and the back of the copper foil are arranged to face each other, friction may occur with the surface depending on the state of the back. As a result, even if metal anti-rust treatment or organic anti-rust treatment is applied to the surface, the anti-rust treatment layer may still be scraped off due to contact with the inside, and the copper will be exposed, oxidized during storage, and discolored on the surface of the copper foil. However, the copper foil roll of the present invention satisfies the above-mentioned requirements (III) and (IV) especially through the above-mentioned surface (B), can reduce the friction from the above-mentioned surface (B) toward the above-mentioned surface (A), and can prevent the above-mentioned surface (A) from interfering with the above-mentioned surface (B). A) Discoloration caused by uneven friction.

[用途] 本發明的表面處理銅箔適合用於銅張積層板的製造,更適合用於印刷電路板的製造。 包含本發明的該種表面處理銅箔的銅張積層板特別是適合用於在高頻段傳遞特性優異的印刷電路板的製造,以發揮優異的效果。 此外,包含本發明的表面處理銅箔的印刷電路板適合作為在高頻段(特別是1~100GHz的高頻段)使用的高頻段用印刷電路板使用的情形。 [use] The surface-treated copper foil of the present invention is suitable for manufacturing copper laminated boards, and is more suitable for manufacturing printed circuit boards. Copper laminated boards containing the surface-treated copper foil of the present invention are particularly suitable for use in the manufacture of printed circuit boards with excellent transmission characteristics in high frequency bands to exhibit excellent effects. In addition, the printed circuit board containing the surface-treated copper foil of the present invention is suitable for use as a high-frequency band printed circuit board used in a high frequency band (especially a high frequency band of 1 to 100 GHz).

包含本發明的表面處理銅箔的銅張積層板可透過習知方法來形成。具體而言,銅張積層板一般通常是透過將表面處理銅箔與樹脂基材(絕緣基板)積層貼合成表面處理銅箔的粗化面(貼合面)與樹脂基材面對面而製造。特別是,在使用本發明的表面處理銅箔的情形下,於銅張積層板,上述面(B)較佳是與樹脂基材黏貼之面。據此,與樹脂基材之間的密合性較為良好。又,在此種情形下,上述面(A)為抵抗之面,故可提升傳遞特性。The copper laminated board containing the surface-treated copper foil of the present invention can be formed by conventional methods. Specifically, copper laminated boards are generally manufactured by laminating surface-treated copper foil and a resin base material (insulating substrate) so that the roughened surface (bonding surface) of the surface-treated copper foil faces the resin base material. In particular, when using the surface-treated copper foil of the present invention, in a copper laminated board, the above-mentioned surface (B) is preferably the surface to which the resin base material is adhered. Accordingly, the adhesion to the resin base material is relatively good. Also, in this case, the above-mentioned surface (A) is a resistance surface, so the transmission characteristics can be improved.

近年來,伴隨5G或beyond5G的到來,針對銅箔,需要更優異的傳遞特性。 至今為止,關於銅箔的傳遞特性的改善,針對與銅箔的樹脂基材黏貼之面,縮小於表面形成的粗化粒子的大小的方案為主流。但是,針對上述傳遞特性的進一步提升的要求,只透過該種方案,有其限制,針對傳遞特性的進一步提升,需要有效方案。 In recent years, with the arrival of 5G or beyond5G, copper foil has been required to have better transmission characteristics. Until now, the mainstream method for improving the transmission characteristics of copper foil has been to reduce the size of roughened particles formed on the surface of the copper foil that is adhered to the resin base material. However, in response to the requirements for further improvement of the above-mentioned transfer characteristics, only this solution has its limitations. To further improve the transfer characteristics, effective solutions are needed.

因此,本發明人等反覆研究的結果,發現到:透過不只是設計與銅箔的樹脂基材黏貼之面,亦設計其抵抗之面的表面形狀,可提升傳遞特性。具體而言,發現到:透過使用本發明的表面處理銅箔,可提升傳遞特性。 亦即,發現到:本發明的表面處理銅箔的特徵在於:透過面(A)滿足下述要件(I)及(II),將該面(A)作為抵抗之面,可提升傳遞特性。 ・要件(I):於前述表面處理銅箔的表面,依據JIS Z 8741:1997所測量的MD的75度鏡面光澤度Gs MD(75°)相對於TD的75度鏡面光澤度Gs TD(75°)的鏡面光澤度比R(75°)[Gs MD(75°)/Gs TD(75°)]為0.90以上且1.60以下。 ・要件(II):於前述表面處理銅箔的表面,由雷射顯微鏡所測量的展開面積比(Sdr)為3.00%以下。 Therefore, as a result of repeated research, the inventors found that the transmission characteristics can be improved by designing not only the surface that adheres to the resin base material of the copper foil, but also the surface shape of the surface that resists it. Specifically, it was found that the transmission characteristics can be improved by using the surface-treated copper foil of the present invention. That is, it was found that the surface-treated copper foil of the present invention is characterized in that the transmission surface (A) satisfies the following requirements (I) and (II), and that the transmission characteristics can be improved by using this surface (A) as a resistance surface.・Requirement (I): On the surface of the above-mentioned surface-treated copper foil, the 75-degree specular gloss Gs MD (75°) of MD measured in accordance with JIS Z 8741:1997 relative to the 75-degree specular gloss Gs TD (75) of TD °), the specular gloss ratio R (75°) [Gs MD (75°)/Gs TD (75°)] is 0.90 or more and 1.60 or less.・Requirement (II): The developed area ratio (Sdr) measured by a laser microscope on the surface of the aforementioned surface-treated copper foil is 3.00% or less.

值得注意的是,樹脂基材例如包括可撓樹脂基板或硬樹脂基板等,但本發明的表面處理銅箔特別是適合與要求高頻段的傳遞特性及高密合性的硬樹脂基板組合。It is worth noting that the resin substrate includes, for example, a flexible resin substrate or a hard resin substrate, but the surface-treated copper foil of the present invention is particularly suitable for combination with a hard resin substrate that requires high-frequency transmission characteristics and high adhesion.

又,在製造印刷電路板用銅張積層板的情形下,將具有矽烷偶聯劑層的表面處理銅箔與樹脂基材透過熱壓機來貼合,據此製造即可。值得注意的是,在樹脂基材上塗布矽烷偶聯劑,將塗布有矽烷偶聯劑的樹脂基材與最表面具有防鏽處理層的表面處理銅箔透過熱壓機來貼合,據此製造的印刷電路板用銅張積層板,與使用具有上述矽烷偶聯劑層的表面處理銅箔的情形,亦具有相同效果。Moreover, when manufacturing a copper laminated board for a printed circuit board, the surface-treated copper foil which has a silane coupling agent layer, and a resin base material are bonded together through a hot press, and it may be manufactured accordingly. It is worth noting that a silane coupling agent is coated on the resin base material, and the resin base material coated with the silane coupling agent and the surface-treated copper foil with an anti-rust treatment layer on the outermost surface are bonded through a hot press. The produced copper laminated board for printed circuit boards also has the same effect as when the surface-treated copper foil having the above-mentioned silane coupling agent layer is used.

又,包含本發明的表面處理銅箔的印刷電路板可透過習知方法來形成。具體而言,使用上述印刷電路板用銅張積層板來形成即可。該種印刷電路板較佳是具備上述印刷電路板用銅張積層板。In addition, the printed circuit board containing the surface-treated copper foil of the present invention can be formed by a conventional method. Specifically, it may be formed using the above-mentioned copper laminated board for printed circuit boards. This type of printed circuit board preferably includes the above-mentioned copper laminated board for printed circuit boards.

又,本發明的表面處理銅箔亦可適合作為鋰離子二次電池等負極集電體來使用。 包含本發明的表面處理銅箔的負極集電體可透過習知方法來形成。具體而言,可將碳粒子等塗布於銅箔的表面,加以乾燥,進一步押壓,作為負極活物質層,據此形成。 In addition, the surface-treated copper foil of the present invention can also be suitably used as a negative electrode current collector for lithium ion secondary batteries and the like. The negative electrode current collector including the surface-treated copper foil of the present invention can be formed by conventional methods. Specifically, carbon particles or the like can be applied to the surface of a copper foil, dried, and further pressed to form a negative electrode active material layer.

針對本發明的實施形態已說明如上,但上述實施形態只是本發明的一例。本發明包含本發明的概念及包含於申請專利範圍的各種態樣,在本發明的範圍內可進行各種改變。 [實施例] The embodiments of the present invention have been described above, but the above-mentioned embodiments are only examples of the present invention. The present invention includes the concept of the present invention and various aspects included in the scope of the patent application, and various changes can be made within the scope of the present invention. [Example]

基於實施例進一步詳細說明本發明如下,但以下只是本發明的一例。The present invention will be described in further detail below based on examples, but the following is only an example of the present invention.

(製造例1:銅箔基體的準備) 使用下述陰極及陽極,使用下述組成的硫酸銅電解液,根據下述電解條件,製造厚度18μm的卷狀的電解銅箔(雙面光澤箔),作為銅箔基體。 <陰極及陽極> 陰極:透過#1000~#2500的拋光膏研磨來調整表面粗糙度的鈦製的旋轉滾筒 陽極:尺寸穩定性陽極DSA(註冊商標) <電解液組成> 五水硫酸銅:由銅(原子)換算,80g/L 硫酸:70g/L 氯濃度:25mg/L (添加劑) ・3-巰基-1-丙磺酸鈉:2mg/L ・羥乙基纖維素:10mg/L ・低分子量膠(分子量3000):50mg/L <電解條件> 液溫:55℃ 電流密度:45A/dm 2 (Manufacture Example 1: Preparation of copper foil base) The following cathode and anode were used, and the copper sulfate electrolyte of the following composition was used, and according to the following electrolysis conditions, a roll-shaped electrolytic copper foil (double-sided glossy foil) with a thickness of 18 μm was produced. , as the copper foil base. <Cathode and Anode> Cathode: Titanium rotating drum whose surface roughness is adjusted by polishing with #1000~#2500 polishing paste. Anode: Dimensional stability anode DSA (registered trademark) <Electrolyte composition> Copper sulfate pentahydrate: made of Copper (atom) conversion, 80g/L Sulfuric acid: 70g/L Chlorine concentration: 25mg/L (Additive) ・Sodium 3-mercapto-1-propanesulfonate: 2mg/L ・Hydroxyethyl cellulose: 10mg/L ・Low Molecular weight glue (molecular weight 3000): 50mg/L <Electrolysis conditions> Liquid temperature: 55℃ Current density: 45A/dm 2

(製造例2:銅箔基體的準備) 將在無氧銅中添加各種微量元素的錠以壓延機來重複壓延,製造厚度18μm的卷狀的壓延銅箔(雙面光澤箔),作為銅箔基體。 (Manufacturing Example 2: Preparation of copper foil base) An ingot in which various trace elements are added to oxygen-free copper is repeatedly rolled in a calender to produce a roll-shaped rolled copper foil (double-sided glossy foil) with a thickness of 18 μm as a copper foil base.

(比較製造例1:銅箔基體的準備) 使用下述陰極及陽極,使用下述組成的硫酸銅電解液,根據下述電解條件,製造厚度70μm的卷狀的電解銅箔(雙面光澤箔),作為銅箔基體。 <陰極及陽極> 陰極:透過#2000的拋光膏研磨來調整表面粗糙度的鈦製的旋轉滾筒 陽極:尺寸穩定性陽極DSA(註冊商標) <電解液組成> 五水硫酸銅:由銅(原子)換算,80g/L 硫酸:140g/L 氯濃度:25mg/L (添加劑) ・雙-3-磺丙基二硫化物二硫化物二鈉(SPS):5mg/L ・DDAC聚合物(森卡股份有限公司,UNISENCE FPA100L):30mg/L <電解條件> 液溫:50℃ 電流密度:60A/dm 2 (Comparative Production Example 1: Preparation of copper foil base) The following cathode and anode were used, and the copper sulfate electrolyte of the following composition was used, and according to the following electrolysis conditions, a roll-shaped electrolytic copper foil (double-sided glossy foil) with a thickness of 70 μm was produced. ), as the copper foil base. <Cathode and Anode> Cathode: Titanium rotating drum whose surface roughness is adjusted by polishing with #2000 polishing paste. Anode: Dimensional stability anode DSA (registered trademark) <Electrolyte composition> Copper sulfate pentahydrate: composed of copper (atoms) ) conversion, 80g/L sulfuric acid: 140g/L chlorine concentration: 25mg/L (additive) ・Bis-3-sulfopropyl disulfide disodium disulfide (SPS): 5mg/L ・DDAC polymer (Senka Co., Ltd., UNISENCE FPA100L): 30mg/L <Electrolysis conditions> Liquid temperature: 50℃ Current density: 60A/dm 2

(實施例1) 在實施例1中,將製造例1所製造的電解銅箔作為銅箔基體使用,針對該銅箔基體,進行以下處理,獲得表面處理銅箔。詳細說明如下。 (Example 1) In Example 1, the electrolytic copper foil produced in Production Example 1 was used as a copper foil base body, and the following processing was performed on the copper foil base body to obtain a surface-treated copper foil. Details are as follows.

〔針對對應於面(A)的面的處理〕 首先,將銅箔基體的製造例1所製造的電解銅箔的滾筒面作為面(A),針對該面(A),在下述條件下以〔A1〕依序施加平坦化處理及〔A2〕防鏽處理。 [Processing for the face corresponding to face (A)] First, the drum surface of the electrolytic copper foil manufactured in Manufacturing Example 1 of the copper foil base was used as the surface (A). The surface (A) was subjected to the planarization treatment [A1] and [A2] in sequence under the following conditions. Anti-rust treatment.

〔A1〕平坦化處理 針對銅箔基體的面(A),使用具有下述電解液組成的焦磷酸銅水溶液,在下述條件下進行直流陽極溶解,作為平坦化處理。 <電解液組成(焦磷酸銅水溶液)> 三水焦磷酸銅:100g/L 焦磷酸鉀:350g/L 氨:0.75g/L 乙基黃原酸鉀:20mg/L <陰極及陽極> 陰極:無氧銅 陽極:製造例1所製造的電解銅箔的滾筒面 <電解條件> 電解液的液溫、陽極電流密度、溶解時間、及電荷密度如表1所記載。 [A1] Flattening treatment For the surface (A) of the copper foil base, a copper pyrophosphate aqueous solution having the following electrolyte composition was used, and DC anode dissolution was performed under the following conditions as a planarization process. <Electrolyte composition (copper pyrophosphate aqueous solution)> Copper pyrophosphate trihydrate: 100g/L Potassium pyrophosphate: 350g/L Ammonia: 0.75g/L Potassium ethyl xanthate: 20mg/L <Cathode and Anode> Cathode: oxygen-free copper Anode: The drum surface of the electrolytic copper foil produced in Production Example 1 <Electrolysis conditions> The liquid temperature, anode current density, dissolution time, and charge density of the electrolyte are as shown in Table 1.

〔A2〕防鏽處理 針對上述〔A1〕平坦化處理後的面(A),在下述條件下施加有機防鏽處理,作為防鏽處理。 ・有機防鏽處理 於上述〔A1〕平坦化處理後的面(A),塗布濃度2質量%的N-2-(氨乙基)-3-氨丙基三甲氧基矽烷水溶液,在100℃下使其乾燥,形成有機防鏽處理層。 〔A2〕Anti-rust treatment As for the surface (A) after the above-mentioned [A1] planarization process, an organic anti-rust treatment was applied under the following conditions as anti-rust treatment. ・Organic anti-rust treatment On the surface (A) after the planarization treatment of the above [A1], apply an aqueous solution of N-2-(aminoethyl)-3-aminopropyltrimethoxysilane with a concentration of 2% by mass, and dry it at 100°C. Form an organic anti-rust treatment layer.

〔針對對應於面(B)的面的處理〕 接著,針對製造例1所製造的電解銅箔的非滾筒面,在下述條件下依序施加〔B1〕粗化處理及〔B2〕防鏽處理,作為上述面(A)的相反面的面(B)。 [Processing for the face corresponding to face (B)] Next, [B1] roughening treatment and [B2] anti-rust treatment were sequentially applied to the non-roller surface of the electrolytic copper foil produced in Production Example 1 under the following conditions, as the surface opposite to the above-mentioned surface (A) ( B).

〔B1〕粗化處理 粗化處理是針對銅箔基體的面(B),以卷對卷的方式來進行粗化電鍍處理及固定電鍍處理2階段的電鍍處理,形成粗化處理層。粗化電鍍處理及固定電鍍處理在以下條件下進行。 ・粗化電鍍處理 使用下述硫酸銅水溶液,在下述條件下進行電鍍處理。 <電解液組成> 五水硫酸銅:由銅(原子)換算,60g/L 硫酸:100g/L <電解條件> 電流密度、處理時間、及電荷密度如表1所記載。其他條件如下。 液溫:30℃ 處理速度:11m/分 ・固定電鍍處理 使用下述硫酸銅水溶液,在下述條件下進行電鍍處理。 <電解液組成> 五水硫酸銅:由銅(原子)換算,100g/L 硫酸:150g/L <電解條件> 液溫:50℃ 電流密度:5A/dm 2處理時間:10秒 電荷密度:50C/dm 2處理速度:11m/分 [B1] Roughening treatment The roughening treatment is a two-stage plating treatment of roughening plating treatment and fixed plating treatment on the surface (B) of the copper foil base in a roll-to-roll manner to form a roughened treatment layer. The roughening plating treatment and the fixing plating treatment are performed under the following conditions.・Roughening plating treatment uses the following copper sulfate aqueous solution and performs plating treatment under the following conditions. <Electrolytic solution composition> Copper sulfate pentahydrate: converted to copper (atom), 60g/L Sulfuric acid: 100g/L <Electrolysis conditions> The current density, treatment time, and charge density are as shown in Table 1. Other conditions are as follows. Liquid temperature: 30°C Processing speed: 11m/min・For fixed plating treatment, use the following copper sulfate aqueous solution and perform plating treatment under the following conditions. <Electrolyte composition> Copper sulfate pentahydrate: converted from copper (atom), 100g/L Sulfuric acid: 150g/L <Electrolysis conditions> Liquid temperature: 50℃ Current density: 5A/dm 2 Processing time: 10 seconds Charge density: 50C /dm 2 processing speed: 11m/min

〔B2〕防鏽處理 針對上述〔B1〕粗化處理後的面(B),在下述條件下依序施加金屬防鏽處理及有機防鏽處理,作為防鏽處理。 ・金屬防鏽處理 於上述〔B1〕粗化處理後的面(B),在下述條件下以Ni、Zn、Cr的順序來施加金屬電鍍,形成金屬防鏽處理層。 <Ni電鍍條件> Ni:40g/L H 3BO 3:5g/L 液溫:20℃ pH:3.6 電流密度:0.2A/dm 2處理時間:10秒 <Zn電鍍條件> Zn:2.5g/L NaOH:40g/L 液溫:20℃ 電流密度:0.3A/dm 2處理時間:5秒 <Cr電鍍條件> Cr:5g/L 液溫:30℃ pH:2.2 電流密度:5A/dm 2處理時間:5秒 ・有機防鏽處理 於上述形成的金屬防鏽處理層(特別是,最表面的Cr電鍍層)上,塗布濃度0.2質量%的3-縮水甘油氧基丙基三甲氧基矽烷水溶液,在100℃下使其乾燥,形成有機防鏽處理層。 [B2] Anti-rust treatment: As for the surface (B) after the roughening treatment of the above [B1], metal anti-rust treatment and organic anti-rust treatment are sequentially applied under the following conditions as anti-rust treatment.・Metal anti-rust treatment: Apply metal plating in the order of Ni, Zn, and Cr under the following conditions to the surface (B) after the roughening process of [B1] above to form a metal anti-rust treatment layer. <Ni plating conditions> Ni: 40g/L H 3 BO 3 : 5g/L Liquid temperature: 20°C pH: 3.6 Current density: 0.2A/dm 2 Processing time: 10 seconds <Zn plating conditions> Zn: 2.5g/L NaOH : 40g/L Liquid temperature: 20℃ Current density: 0.3A/dm 2Processing time: 5 seconds <Cr plating conditions> Cr: 5g/L Liquid temperature: 30℃ pH: 2.2 Current density: 5A/dm 2Processing time: 5 seconds・Organic anti-rust treatment On the metal anti-rust treatment layer (especially the surface Cr plating layer) formed above, apply an aqueous solution of 3-glycidoxypropyltrimethoxysilane with a concentration of 0.2% by mass, and Dry it at 100°C to form an organic anti-rust treatment layer.

(實施例2) 實施例2是針對面(B),不進行〔B1〕粗化處理,除此之外,在表1所記載的條件下,以與實施例1相同的方法來獲得表面處理銅箔。 (Example 2) In Example 2, surface-treated copper foil was obtained by the same method as Example 1 except that the [B1] roughening treatment was not performed on the surface (B). Under the conditions described in Table 1, a surface-treated copper foil was obtained.

(實施例3) 實施例3是將銅箔基體的製造例1所製造的電解銅箔的非滾筒面作為面(A),將滾筒面作為面(B),除此之外,在表1所記載的條件下,以與實施例1相同的方法來獲得表面處理銅箔。 (Example 3) In Example 3, the non-cylindrical surface of the electrolytic copper foil produced in Example 1 of Production of the Copper Foil Base was used as the surface (A) and the cylinder surface was used as the surface (B), under the conditions described in Table 1. , the surface-treated copper foil was obtained in the same method as Example 1.

(實施例4) 實施例4是針對面(A),在下述條件下,依序進行金屬防鏽處理及有機防鏽處理,作為〔A2〕防鏽處理,針對面(B),不進行〔B1〕粗化處理,除此之外,在表1所記載的條件下,以與實施例3相同的方法來獲得表面處理銅箔。 ・金屬防鏽處理 於上述〔A1〕平坦化處理後的面(A),在下述條件下以Zn、Cr的順序施加金屬電鍍,形成金屬防鏽處理層。 <Zn電鍍條件> 除了電流密度之外,與上述〔B2〕防鏽處理的Zn電鍍條件相同。值得注意的是,電流密度是表1所記載的條件。 <Cr電鍍條件> 除了電流密度之外,與上述〔B2〕防鏽處理的Cr電鍍條件相同。值得注意的是,電流密度是表1所記載的條件。 (Example 4) Example 4 is for surface (A). Under the following conditions, metal anti-rust treatment and organic anti-rust treatment are sequentially performed as [A2] anti-rust treatment. For surface (B), [B1] roughening treatment is not performed. , Except for this, under the conditions described in Table 1, a surface-treated copper foil was obtained in the same manner as in Example 3. ・Metal anti-rust treatment On the surface (A) after the planarization process of the above [A1], metal plating is applied in the order of Zn and Cr under the following conditions to form a metal anti-rust treatment layer. <Zn plating conditions> Except for the current density, the Zn plating conditions are the same as the above [B2] anti-rust treatment. It is worth noting that the current density is the condition recorded in Table 1. <Cr plating conditions> Except for the current density, the Cr plating conditions are the same as those for the above [B2] anti-rust treatment. It is worth noting that the current density is the condition recorded in Table 1.

<有機防鏽處理> 於上述形成的金屬防鏽處理層(特別是,最表面的Cr電鍍層)上,塗布濃度2質量%的N-2-(氨乙基)-3-氨丙基三甲氧基矽烷水溶液,在100℃下使其乾燥,形成有機防鏽處理層。 <Organic anti-rust treatment> On the metal anti-rust treatment layer (especially the surface Cr plating layer) formed above, an N-2-(aminoethyl)-3-aminopropyltrimethoxysilane aqueous solution with a concentration of 2% by mass was applied. Dry it at 100°C to form an organic anti-rust treatment layer.

(實施例5~13) 實施例5~13是針對面(A),在下述條件下只進行金屬防鏽處理,作為〔A2〕防鏽處理,除此之外,在表1所記載的條件下,以與實施例1相同的方法來獲得表面處理銅箔。 ・金屬防鏽處理 於上述〔A1〕平坦化處理後的面(A),在下述條件下施加Zn及/或Cr電鍍,形成金屬防鏽處理層。 <Zn電鍍條件> 除了電流密度之外,與上述〔B2〕防鏽處理的Zn電鍍條件相同。值得注意的是,電流密度是表1所記載的條件。 <Cr電鍍條件> 除了電流密度之外,與上述〔B2〕防鏽處理的Cr電鍍條件相同。值得注意的是,電流密度是表1所記載的條件。 (Examples 5 to 13) Examples 5 to 13 are for surface (A). Only metal anti-rust treatment is performed under the following conditions as [A2] anti-rust treatment. In addition, under the conditions described in Table 1, the same treatment as in Example 1 is performed. The same method is used to obtain surface treated copper foil. ・Metal anti-rust treatment On the surface (A) after the planarization treatment of the above [A1], Zn and/or Cr electroplating is applied under the following conditions to form a metal anti-rust treatment layer. <Zn plating conditions> Except for the current density, the Zn plating conditions are the same as the above [B2] anti-rust treatment. It is worth noting that the current density is the condition recorded in Table 1. <Cr plating conditions> Except for the current density, the Cr plating conditions are the same as those for the above [B2] anti-rust treatment. It is worth noting that the current density is the condition recorded in Table 1.

(實施例14) 實施例14是使用製造例2所製造的壓延銅箔作為銅箔基體,將該壓延銅箔的一側的面作為面(A),將另一側的面作為面(B),除此之外,在表1所記載的條件下,以與實施例8相同的方法來獲得表面處理銅箔。 (Example 14) In Example 14, the rolled copper foil produced in Production Example 2 was used as the copper foil base, and one side of the rolled copper foil was designated as surface (A) and the other side was designated as surface (B). Except that, under the conditions described in Table 1, a surface-treated copper foil was obtained in the same method as Example 8.

(比較例1) 比較例1是使用比較製造例1所製造的電解銅箔作為銅箔基體,將該電解銅箔的非滾筒面作為面(A),將滾筒面作為面(B),針對面(A),不進行〔A1〕平坦化處理,針對面(B),不進行〔B1〕粗化處理,除此之外,在表1所記載的條件下,以與實施例8相同的方法來獲得表面處理銅箔。 (Comparative example 1) In Comparative Example 1, the electrolytic copper foil produced in Comparative Production Example 1 was used as a copper foil base, and the non-cylinder surface of the electrolytic copper foil was referred to as surface (A), and the cylinder surface was referred to as surface (B). Regarding surface (A), The surface treatment was obtained in the same manner as in Example 8 under the conditions described in Table 1 except that [A1] planarization was not performed and surface (B) was not subjected to [B1] roughening. copper foil.

(比較例2) 比較例2是使用製造例1所製造的電解銅箔作為銅箔基體,將該電解銅箔的非滾筒面作為面(A),將滾筒面作為面(B),針對面(A),不進行〔A1〕平坦化處理,在下述條件下進行電解研磨,針對面(B),不進行〔B1〕粗化處理,除此之外,在表1所記載的條件下,以與實施例8相同的方法來獲得表面處理銅箔。 ・電解研磨 針對銅箔基體的面(A),使用具有下述電解液組成的磷酸-硫酸水溶液,在下述條件下進行電解研磨。 <磷酸-硫酸水溶液的組成> 磷酸:67質量% 硫酸:10質量% 水:23質量% <電解研磨條件> 定電壓:10V/cm 2處理時間:60秒 (Comparative Example 2) In Comparative Example 2, the electrolytic copper foil produced in Production Example 1 was used as a copper foil base, and the non-cylindrical surface of the electrolytic copper foil was referred to as surface (A), and the cylinder surface was referred to as surface (B). (A), without [A1] planarization treatment, electrolytic polishing is performed under the following conditions. For surface (B), without [B1] roughening treatment, under the conditions described in Table 1, A surface-treated copper foil was obtained in the same manner as in Example 8.・Electrolytic polishing was performed on the surface (A) of the copper foil base using a phosphoric acid-sulfuric acid aqueous solution having the following electrolyte composition and under the following conditions. <Composition of phosphoric acid-sulfuric acid aqueous solution> Phosphoric acid: 67 mass% Sulfuric acid: 10 mass% Water: 23 mass% <Electrolytic polishing conditions> Constant voltage: 10V/cm 2 Processing time: 60 seconds

(比較例3) 比較例3是針對面(A),在上述〔A1〕平坦化處理中,使用具有下述電解液組成的焦磷酸銅水溶液,針對面(B),不進行〔B1〕粗化處理,除此之外,在表1所記載的條件下,以與實施例8相同的方法來獲得表面處理銅箔。 <電解液組成(焦磷酸銅水溶液)> 三水焦磷酸銅:80g/L 焦磷酸鉀:300g/L 氨:0.25g/L (Comparative example 3) Comparative Example 3 is for surface (A). In the above-mentioned [A1] planarization treatment, a copper pyrophosphate aqueous solution having the following electrolyte composition is used. For surface (B), [B1] roughening treatment is not performed, except that Except for this, a surface-treated copper foil was obtained in the same manner as in Example 8 under the conditions described in Table 1. <Electrolyte composition (copper pyrophosphate aqueous solution)> Copper pyrophosphate trihydrate: 80g/L Potassium pyrophosphate: 300g/L Ammonia: 0.25g/L

(比較例4及5) 比較例4及5是在表1所記載的條件下,以與實施例1相同的方法來獲得表面處理銅箔。 (Comparative Examples 4 and 5) In Comparative Examples 4 and 5, under the conditions described in Table 1, surface-treated copper foils were obtained in the same method as Example 1.

(比較例6) 比較例6是在表1所記載的條件下,以與實施例8相同的方法來獲得表面處理銅箔。 (Comparative example 6) In Comparative Example 6, under the conditions described in Table 1, a surface-treated copper foil was obtained in the same method as Example 8.

[表1] [Table 1]

(評價) 針對上述實施例及比較例的表面處理銅箔,進行如下所示的特性評價。各特性的評價條件如下,除了特別指明之外,各測量在室溫(25℃±2℃)下進行。將結果顯示於表2。 (evaluation) The following characteristic evaluation was performed on the surface-treated copper foils of the above-mentioned Examples and Comparative Examples. The evaluation conditions for each characteristic are as follows. Unless otherwise specified, each measurement is performed at room temperature (25°C ± 2°C). The results are shown in Table 2.

[鏡面光澤度] 針對表面處理銅箔的面(A)及面(B),使用光澤度計(日本電色工業股份有限公司製,VG7000),基於JIS Z 8741:1997,分別測量TD的75度鏡面光澤度Gs(75°)及MD的75度鏡面光澤度Gs(75°)。值得注意的是,測量是於表面處理銅箔的長度方向(搬送方向,MD)及相對於長度方向的正交方向(TD)以受光角75°各實施5次。針對各方向,將測量值(N=5)加以平均,將各平均值作為各75度鏡面光澤度Gs(75°)。此外,從75度鏡面光澤度Gs(75°)算出MD的75度鏡面光澤度Gs MD(75°)相對於各TD的75度鏡面光澤度Gs TD(75°)的鏡面光澤度比R(75°)[Gs MD(75°)/Gs TD(75°)]。 又,以與上述75度鏡面光澤度Gs(75°)的情形相同的方法,針對表面處理銅箔的面(A),針對各方向,測量60度鏡面光澤度Gs(60°),算出MD的60度鏡面光澤度Gs MD(60°)相對於TD的60度鏡面光澤度Gs TD(60°)的鏡面光澤度比R(60°)[Gs MD(60°)/Gs TD(60°)]。 [Specular gloss] For the surface (A) and surface (B) of the surface-treated copper foil, use a gloss meter (VG7000 manufactured by Nippon Denshoku Industries Co., Ltd.) based on JIS Z 8741: 1997 to measure 75 of the TD. 75 degree mirror gloss Gs (75°) and MD 75 degree mirror gloss Gs (75°). It is worth noting that the measurement was performed five times each in the longitudinal direction (conveyance direction, MD) and the orthogonal direction (TD) to the longitudinal direction of the surface-treated copper foil at a light receiving angle of 75°. The measured values (N=5) were averaged for each direction, and each average value was used as each 75-degree specular gloss Gs (75°). In addition, from the 75-degree specular gloss Gs (75°), the specular gloss ratio R ( 75°) [Gs MD (75°)/Gs TD (75°)]. In addition, in the same manner as in the case of the 75-degree specular gloss Gs (75°) described above, the 60-degree specular gloss Gs (60°) was measured in each direction on the surface (A) of the surface-treated copper foil, and the MD was calculated. The 60-degree specular gloss Gs MD (60°) relative to the TD The 60-degree specular gloss Gs TD (60°) specular gloss ratio R (60°) [Gs MD (60°)/Gs TD (60°) )].

[展開面積比(Sdr)] 針對表面處理銅箔的面(A)及面(B),使用共焦點雷射顯微鏡(基恩斯股份有限公司製,VK-X1050及VK-X1000),按照ISO25178,測量展開面積比(Sdr)。測量是分別實施於任意5點,將測量值(N=5)加以平均,將該平均值作為各面的展開面積比(Sdr)。 值得注意的是,共聚焦雷射顯微鏡的物鏡倍率為100倍,掃描模式為雷射共聚焦,測量尺寸為2048×1536,測量品質為高精細,間距為0.08μm。 又,Sdr的演算是以如下所示的過濾器處理及演算條件來進行。 畫像處理:平滑處理(3×3,中位數) S過濾器:無 F-operation:平面傾斜修正 L過濾器:0.025μm(高斯) 演算對象面積:100μm×100μm [Developed area ratio (Sdr)] The developed area ratio (Sdr) of the surfaces (A) and (B) of the surface-treated copper foil was measured using a confocal laser microscope (VK-X1050 and VK-X1000 manufactured by Keynes Co., Ltd.) in accordance with ISO25178. The measurement is performed at any five points, the measured values (N=5) are averaged, and the average value is used as the developed area ratio (Sdr) of each surface. It is worth noting that the objective magnification of the confocal laser microscope is 100 times, the scanning mode is laser confocal, the measurement size is 2048×1536, the measurement quality is high precision, and the pitch is 0.08 μm. In addition, the calculation of Sdr is performed based on the filter processing and calculation conditions shown below. Image processing: smoothing (3×3, median) S filter: none F-operation: plane tilt correction L filter: 0.025μm (Gaussian) Calculation target area: 100μm×100μm

[Zn、Cr、及Si附著量] 針對表面處理銅箔的面(A),使用掃描型螢光X光分析裝置(Rigaku股份有限公司製,ZSX Primus IV),透過以螢光X光分析法來分析,分別測量Zn、Cr、及Si附著量。值得注意的是,各原子的數量是使用已知的標準樣品所獲得的校準曲線來定量。 [Zn, Cr, and Si adhesion amount] For the surface (A) of the surface-treated copper foil, a scanning fluorescence X-ray analysis device (manufactured by Rigaku Co., Ltd., ZSX Primus IV) was used to analyze by fluorescence X-ray analysis, and Zn, Cr, and Si adhesion amount. It is worth noting that the number of each atom is quantified using a calibration curve obtained from a known standard sample.

[面(A)的變色的評價] 進行下述變色實驗,以下述評價基準來評價,作為面(A)的變色的評價。 (變色實驗) 變色實驗是使用將表面處理銅箔的面(A)作為外側,在面(A)與面(B)接觸的狀態下捲繞而成的銅箔卷,在下述條件下進行。 (1)常態保存 將上述銅箔卷保存於維持在溫度20℃±2℃、濕度3%RH以下的乾燥器,針對1個月、3個月、12個月,將銅箔切分成大小1m 2的3片,獲得評價用樣本。 (2)高濕保存 將上述銅箔卷保存於維持在溫度20℃±2℃、濕度50%RH±5%RH下的恆溫恆濕槽,針對1個月、3個月、12個月,將銅箔切分成大小1m 2的3片,獲得評價用樣本。 [Evaluation of discoloration of surface (A)] The following discoloration experiment was performed and evaluated based on the following evaluation standards as an evaluation of discoloration of surface (A). (Discoloration Test) The discoloration test was performed under the following conditions using a copper foil roll wound with the surface (A) of the surface-treated copper foil as the outer side and with the surface (A) and the surface (B) in contact. (1) Normal storage: Store the above copper foil roll in a dryer maintained at a temperature of 20°C ± 2°C and a humidity below 3% RH. Cut the copper foil into 1m-sized pieces for 1 month, 3 months, and 12 months. 3 tablets of 2 were obtained to obtain a sample for evaluation. (2) High-humidity storage: Store the above copper foil roll in a constant temperature and humidity chamber maintained at a temperature of 20°C ± 2°C and a humidity of 50% RH ± 5% RH. For 1 month, 3 months, and 12 months, The copper foil was cut into three pieces with a size of 1 m2 , and samples for evaluation were obtained.

(觀察) 針對上述獲得的各自的評價用樣本,在下述條件下,評價面(A)有無變色。 <1>首先,針對全部上述獲得的評價用樣本3片,在原本的狀態下觀察面(A),確認面(A)有無變色。在此,3片評價用樣本至少1枚確認到變色者評價為「C(不可)」。 <2>在上述<1>中,3片評價用樣本皆未確認到變色的表面處理銅箔則進一步進行下述實驗,進一步將面(A)的表面特性評價為(S~B)。 <2-1>首先,將上述獲得的評價用樣本(1m 2)切分成大小0.3m 2,切分出實驗片5片。接著,將該5片實驗片在高度加速壽命實驗裝置(Espec公司製,EHS-222(M))內,透過濕潤飽和控制,在溫度110℃±2℃、濕度100%RH的環境下保持24小時。其後,針對全部5片實驗片,觀察面(A),確認有無變色。在此,5片實驗片至少1片確認到變色者評價為「B(可)」,5片實驗片皆未確認到變色者則進行下述<2-2>的評價。 <2-2>將上述獲得的評價用樣本(1m 2)切分成大小0.3m 2,切分出實驗片5片。接著,將該5片實驗片在高度加速壽命實驗裝置(同上)內,透過濕潤飽和控制,在溫度110℃±2℃、濕度100%RH的環境下保持96小時。其後,針對全部5片實驗片,觀察面(A),確認有無變色。在此,5片實驗片至少1片確認到變色者評價為「A(良)」,5片實驗片皆未確認到變色者評價為「S(優)」。 (評價基準) S(優):上述<1>、<2-1>、及<2-2>皆無變色 A(良):上述<1>及<2-1>皆無變色,<2-2>有變色 B(可):上述<1>無變色,上述<2-1>有變色 C(不可):上述<1>有變色 (Observation) For each evaluation sample obtained above, the presence or absence of discoloration on the surface (A) was evaluated under the following conditions. <1> First, for all three evaluation samples obtained above, the surface (A) was observed in its original state to confirm whether or not the surface (A) was discolored. Here, if discoloration is confirmed in at least one of the three evaluation samples, the evaluation will be "C (impossible)". <2> In the above <1>, for the surface-treated copper foil in which discoloration was not confirmed in any of the three evaluation samples, the following experiment was further performed, and the surface characteristics of the surface (A) were further evaluated as (S to B). <2-1> First, the evaluation sample (1 m 2 ) obtained above was cut into 0.3 m 2 in size, and five test pieces were cut out. Next, the five test pieces were kept in a highly accelerated life test device (EHS-222 (M) manufactured by Espec Co., Ltd.) through moisture saturation control, and maintained for 24 hours in an environment with a temperature of 110°C ± 2°C and a humidity of 100% RH. hours. Thereafter, all five test pieces were observed and the surface (A) was observed to confirm whether there was any discoloration. Here, if discoloration is confirmed in at least one of the five test pieces, the evaluation is "B (acceptable)". If discoloration is not confirmed in any of the five test pieces, the following <2-2> evaluation will be performed. <2-2> Cut the evaluation sample (1m 2 ) obtained above into 0.3m 2 in size, and cut out 5 test pieces. Next, the five test pieces were kept in a highly accelerated life test device (same as above) for 96 hours under moisture saturation control at a temperature of 110°C ± 2°C and a humidity of 100% RH. Thereafter, all five test pieces were observed and the surface (A) was observed to confirm whether there was any discoloration. Here, those in which discoloration was confirmed in at least one of the five test pieces were evaluated as "A (good)", and those in which discoloration was not confirmed in any of the five test pieces were evaluated as "S (excellent)". (Evaluation criteria) S (Excellent): There is no discoloration in any of the above <1>, <2-1>, and <2-2> A (Good): There is no discoloration in any of the above <1> and <2-1>, <2-2 >Discoloration B (possible): No discoloration in the above <1>, discoloration in the above <2-1> C (not possible): discoloration in the above <1>

(綜合評價) 此外,彙整上述評價結果,以下述基準來綜合評價變色的抑制效果。 <合格> S:全部評價為S A+:高濕保存12個月的評價為A,其他評價為S A:常態保存12個月及高濕保存12個月的評價皆為A,其他評價為A或S B++:高濕保存12個月的評價為B,其他評價為A或S(存在至少1個S) B+:高濕保存12個月的評價為B,其他評價為A B:高濕保存3個月以上的評價為B,其他評價為A或S C+:常態保存12個月及高濕保存3個月以上的評價皆為B,其他評價為A或S C:常態保存3個月以上及高濕保存3個月以上的評價皆為B,其他評價為A或S <不合格> D:有C的評價 (comprehensive evaluation) In addition, the above-mentioned evaluation results were compiled and the discoloration-inhibiting effect was comprehensively evaluated based on the following standards. <Qualified> S: All ratings are S A+: The evaluation of high-humidity storage for 12 months is A, and other evaluations are S. A: The evaluations for normal storage for 12 months and high humidity storage for 12 months are all A, and other evaluations are A or S. B++: Evaluation of high-humidity storage for 12 months is B, other evaluations are A or S (there is at least 1 S) B+: The evaluation of high-humidity storage for 12 months is B, and other evaluations are A. B: The evaluation of high-humidity storage for more than 3 months is B, and other evaluations are A or S. C+: Evaluations of normal storage for 12 months and high-humidity storage of more than 3 months are all B, other evaluations are A or S C: Evaluations of normal storage for more than 3 months and high-humidity storage of more than 3 months are all B, and other evaluations are A or S. <Unqualified> D: There is an evaluation of C

[傳遞特性的評價] 測量高頻段的傳遞損失,作為傳遞特性的評價。詳細說明如下。 將聚苯醚系低介電常數樹脂基材(MEGTRON 7,Panasonic股份有限公司製,厚度60μm)與表面處理銅箔貼合,製造傳遞特性測量用的基板。該基板設計成構造為帶狀線構造,導體長度為400mm,導體厚度為18μm,導體寬度為0.14mm,整體厚度為0.39mm,特性阻抗為50Ω。 又,表面處理銅箔與樹脂基材的貼合是將銅箔重疊成表面處理銅箔的面(B)與樹脂基材面對面,在面壓力3.5MPa、200℃的條件下,押壓2小時,據此實施。 針對上述傳遞特性測量用的基板,使用向量網路分析儀E8364C(KEYSIGHTTECHNOLOGIES社),測量40GHz的傳遞損失,從導體長度以dB/m單位來算出。 傳遞損失的測量值的絕對值愈小則傳遞損失愈少,意指傳遞特性良好。將獲得的測量值作為指標,基於下述評價基準來評價傳遞特性。 S:40GHz的傳遞損失的絕對值未達44.0dB A:40GHz的傳遞損失的絕對值為44.0dB以上且50.0dB以下 B:40GHz的傳遞損失的絕對值超過50.0dB [Evaluation of transfer characteristics] The transmission loss in the high frequency band is measured as an evaluation of the transmission characteristics. Details are as follows. A polyphenylene ether-based low dielectric constant resin base material (MEGTRON 7, manufactured by Panasonic Co., Ltd., thickness 60 μm) was bonded to a surface-treated copper foil to produce a substrate for transmission characteristic measurement. The substrate is designed to be constructed in a stripline configuration with a conductor length of 400mm, a conductor thickness of 18μm, a conductor width of 0.14mm, an overall thickness of 0.39mm, and a characteristic impedance of 50Ω. In addition, the surface-treated copper foil and the resin base material are bonded by overlapping the copper foil so that the surface (B) of the surface-treated copper foil faces the resin base material, and pressing it for 2 hours under the conditions of surface pressure 3.5MPa and 200°C. , implemented accordingly. For the substrate used for measuring the above transfer characteristics, the transmission loss at 40 GHz was measured using a vector network analyzer E8364C (KEYSIGHT TECHNOLOGIES) and calculated in dB/m units from the conductor length. The smaller the absolute value of the measured value of the transmission loss is, the smaller the transmission loss is, which means that the transmission characteristics are good. Using the obtained measured values as indicators, the transfer characteristics were evaluated based on the following evaluation criteria. S: The absolute value of transmission loss at 40GHz does not reach 44.0dB A: The absolute value of transmission loss at 40GHz is 44.0dB or more and 50.0dB or less B: The absolute value of the transmission loss at 40GHz exceeds 50.0dB

[表2] [Table 2]

如表2所示,確認到:於面(A),滿足鏡面光澤度比R(75°)[Gs MD(75°)/Gs TD(75°)]為0.90以上且1.60以下(要件(I))及展開面積比(Sdr)為3.00%以下(要件(II))的表面處理銅箔,即使長期保存成銅箔卷,無論保存環境的濕度如何,皆可有效抑制表面的變色(實施例1~14)。 As shown in Table 2, it was confirmed that the surface (A) satisfies the specular gloss ratio R (75°) [Gs MD (75°)/Gs TD (75°)] of 0.90 or more and 1.60 or less (requirement (I) )) and the developed area ratio (Sdr) is 3.00% or less (requirement (II)), even if it is stored as a copper foil roll for a long time, surface discoloration can be effectively suppressed regardless of the humidity of the storage environment (Example 1~14).

另一方面,確認到:不滿足上述要件(I)及要件(II)的至少一者的表面處理銅箔在常態保存下12個月會發生變色,而在高濕保存下3個月會發生變色(比較例1~6)。On the other hand, it was confirmed that surface-treated copper foil that does not meet at least one of the above requirements (I) and (II) will discolor after 12 months of normal storage and 3 months of high-humidity storage. Discoloration (Comparative Examples 1 to 6).

又,確認到:在將本發明的表面處理銅箔用於印刷電路板用途的情形下,可獲得傳遞特性優異的印刷電路板。特別是,確認到:在使用面(B)的展開面積比(Sdr)為120%以下的表面處理銅箔的情形下,可進一步提升傳遞特性(實施例1~4、6、9、及12)。Furthermore, it was confirmed that when the surface-treated copper foil of the present invention is used for printed circuit boards, a printed circuit board excellent in transmission characteristics can be obtained. In particular, it was confirmed that when a surface-treated copper foil with a development area ratio (Sdr) of surface (B) of 120% or less is used, the transmission characteristics can be further improved (Examples 1 to 4, 6, 9, and 12 ).

1:陰極 2:不溶性陽極 3:硫酸銅電解液 4:非滾筒面(M面) 5:滾筒面(S面) 6:電解銅箔 1:Cathode 2: Insoluble anode 3: Copper sulfate electrolyte 4: Non-roller surface (M surface) 5:Roller surface (S surface) 6:Electrolytic copper foil

圖1為電解銅箔的製造裝置的示意圖。Figure 1 is a schematic diagram of an electrolytic copper foil manufacturing device.

1:陰極 1:Cathode

2:不溶性陽極 2: Insoluble anode

3:硫酸銅電解液 3: Copper sulfate electrolyte

4:非滾筒面(M面) 4: Non-roller surface (M surface)

5:滾筒面(S面) 5:Roller surface (S surface)

6:電解銅箔 6:Electrolytic copper foil

Claims (13)

一種表面處理銅箔,其具有一側的面(A)及另一側的面(B); 前述面(A)滿足下述要件(I)及(II): ・要件(I):於前述表面處理銅箔的表面,依據JIS Z 8741:1997所測量的MD的75度鏡面光澤度Gs MD(75°)相對於TD的75度鏡面光澤度Gs TD(75°)的鏡面光澤度比R(75°)[Gs MD(75°)/Gs TD(75°)]為0.90以上且1.60以下; ・要件(II):於前述表面處理銅箔的表面,由雷射顯微鏡所測量的展開面積比(Sdr)為3.00%以下。 A surface-treated copper foil having one side (A) and the other side (B); the aforementioned side (A) satisfies the following requirements (I) and (II): ・Requirement (I): in the aforementioned The surface of the surface treated copper foil is the specular gloss ratio R of the 75-degree specular gloss Gs MD (75°) of MD to the 75-degree specular gloss Gs TD (75°) of TD measured in accordance with JIS Z 8741:1997 (75°) [Gs MD (75°)/Gs TD (75°)] is 0.90 or more and 1.60 or less; ・Requirement (II): The developed area of the surface of the aforementioned surface-treated copper foil measured by a laser microscope Ratio (Sdr) is 3.00% or less. 如請求項1所記載的表面處理銅箔,其中:前述面(B)更滿足下述要件(III)及(IV): ・要件(III):於前述表面處理銅箔的表面,依據JIS Z 8741:1997所測量的MD的75度鏡面光澤度Gs MD(75°)相對於TD的75度鏡面光澤度Gs TD(75°)的鏡面光澤度比R(75°)[Gs MD(75°)/Gs TD(75°)]為0.60以上且1.50以下; ・要件(IV):於前述表面處理銅箔的表面,由雷射顯微鏡所測量的展開面積比(Sdr)為300%以下。 Surface-treated copper foil as described in claim 1, wherein: the aforementioned surface (B) further satisfies the following requirements (III) and (IV): ・Requirement (III): On the surface of the aforementioned surface-treated copper foil, in accordance with JIS Z 8741: Specular gloss ratio R (75°) of the 75-degree specular gloss Gs MD (75°) of MD measured in 1997 relative to the 75-degree specular gloss Gs TD (75°) of TD [Gs MD (75°) )/Gs TD (75°)] is 0.60 or more and 1.50 or less; ・Requirement (IV): The developed area ratio (Sdr) measured by a laser microscope on the surface of the aforementioned surface-treated copper foil is 300% or less. 如請求項1或2所記載的表面處理銅箔,其中:在前述要件(I)中,前述鏡面光澤度比R(75°)[Gs MD(75°)/Gs TD(75°)]為0.95以上且1.50以下。 The surface-treated copper foil as described in claim 1 or 2, wherein: in the aforementioned requirement (I), the aforementioned specular gloss ratio R (75°) [Gs MD (75°)/Gs TD (75°)] is Above 0.95 and below 1.50. 如請求項1~3之中任一項所記載的表面處理銅箔,其中:於前述面(A),Zn附著量為0.001mg/dm 2以上且0.800mg/dm 2以下,或Cr附著量為0.001mg/dm 2以上且0.500mg/dm 2以下。 The surface-treated copper foil according to any one of claims 1 to 3, wherein: on the surface (A), the Zn adhesion amount is 0.001 mg/dm 2 or more and 0.800 mg/dm 2 or less, or the Cr adhesion amount is It is 0.001 mg/dm 2 or more and 0.500 mg/dm 2 or less. 如請求項1~4之中任一項所記載的表面處理銅箔,其中:於前述面(A),Si附著量為0.001mg/dm 2以上且0.500mg/dm 2以下。 The surface-treated copper foil according to any one of claims 1 to 4, wherein the Si adhesion amount on the surface (A) is 0.001 mg/dm 2 or more and 0.500 mg/dm 2 or less. 如請求項2~5之中任一項所記載的表面處理銅箔,其中:在前述要件(IV)中,前述展開面積比(Sdr)為120%以下。The surface-treated copper foil according to any one of claims 2 to 5, wherein in the requirement (IV), the developed area ratio (Sdr) is 120% or less. 如請求項6所記載的表面處理銅箔,其中:在前述要件(IV)中,前述展開面積比(Sdr)為3.00%以下。The surface-treated copper foil according to Claim 6, wherein in the aforementioned requirement (IV), the aforementioned developed area ratio (Sdr) is 3.00% or less. 如請求項1~7之中任一項所記載的表面處理銅箔,其為電解銅箔。The surface-treated copper foil according to any one of claims 1 to 7, which is an electrolytic copper foil. 如請求項8所記載的表面處理銅箔,其中:前述面(A)為從旋轉滾筒狀陰極剝離之面所衍生的面。The surface-treated copper foil according to claim 8, wherein the surface (A) is a surface derived from the surface of the rotating drum-shaped cathode peeled off. 一種銅箔卷,其為如請求項1~9之中任一項所記載的表面處理銅箔所製成的銅箔卷; 將前述面(A)作為外側,在前述面(A)與前述面(B)接觸的狀態下捲繞而成。 A copper foil roll made of the surface-treated copper foil as described in any one of claims 1 to 9; The film is wound with the surface (A) as the outer side and the surface (A) and the surface (B) in contact with each other. 一種銅張積層板,其包含如請求項1~9之中任一項所記載的表面處理銅箔。A copper laminated board including the surface-treated copper foil according to any one of claims 1 to 9. 如請求項11所記載的銅張積層板,其中:前述面(B)為與樹脂基材黏貼之面。The copper laminated board as described in claim 11, wherein: the aforementioned surface (B) is the surface bonded to the resin substrate. 一種印刷電路板,其包含如請求項1~9之中任一項所記載的表面處理銅箔。A printed circuit board including the surface-treated copper foil according to any one of claims 1 to 9.
TW112112387A 2022-03-31 2023-03-31 Surface treated copper foil, copper foil roll, copper clad laminate, and printed wiring board TW202403117A (en)

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