TW202348646A - Resin composition, cured product, prepreg, metal-foil-clad laminate, resin composite sheet, printed circuit board, and semiconductor device - Google Patents
Resin composition, cured product, prepreg, metal-foil-clad laminate, resin composite sheet, printed circuit board, and semiconductor device Download PDFInfo
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- TW202348646A TW202348646A TW112107453A TW112107453A TW202348646A TW 202348646 A TW202348646 A TW 202348646A TW 112107453 A TW112107453 A TW 112107453A TW 112107453 A TW112107453 A TW 112107453A TW 202348646 A TW202348646 A TW 202348646A
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- 239000011342 resin composition Substances 0.000 title claims abstract description 270
- 239000000805 composite resin Substances 0.000 title claims abstract description 18
- 239000004065 semiconductor Substances 0.000 title claims abstract description 12
- 150000001875 compounds Chemical class 0.000 claims abstract description 364
- 229920000642 polymer Polymers 0.000 claims abstract description 92
- 229910052751 metal Inorganic materials 0.000 claims abstract description 43
- 239000002184 metal Substances 0.000 claims abstract description 43
- -1 2,2-propylene group Chemical group 0.000 claims description 175
- 125000004432 carbon atom Chemical group C* 0.000 claims description 140
- 125000000217 alkyl group Chemical group 0.000 claims description 115
- 229920005989 resin Polymers 0.000 claims description 111
- 239000011347 resin Substances 0.000 claims description 111
- 239000007787 solid Substances 0.000 claims description 72
- 239000000463 material Substances 0.000 claims description 68
- 125000004435 hydrogen atom Chemical group [H]* 0.000 claims description 67
- 229920001955 polyphenylene ether Chemical class 0.000 claims description 35
- 125000003903 2-propenyl group Chemical group [H]C([*])([H])C([H])=C([H])[H] 0.000 claims description 34
- 229920002725 thermoplastic elastomer Polymers 0.000 claims description 34
- CREMABGTGYGIQB-UHFFFAOYSA-N carbon carbon Chemical compound C.C CREMABGTGYGIQB-UHFFFAOYSA-N 0.000 claims description 32
- 239000011203 carbon fibre reinforced carbon Substances 0.000 claims description 32
- 125000001424 substituent group Chemical group 0.000 claims description 31
- 125000000962 organic group Chemical group 0.000 claims description 30
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 claims description 30
- 239000011888 foil Substances 0.000 claims description 26
- 125000005843 halogen group Chemical group 0.000 claims description 23
- 125000003118 aryl group Chemical group 0.000 claims description 22
- 239000004593 Epoxy Substances 0.000 claims description 19
- 239000000945 filler Substances 0.000 claims description 18
- AHHWIHXENZJRFG-UHFFFAOYSA-N oxetane Chemical compound C1COC1 AHHWIHXENZJRFG-UHFFFAOYSA-N 0.000 claims description 18
- 125000002887 hydroxy group Chemical group [H]O* 0.000 claims description 12
- 125000003545 alkoxy group Chemical group 0.000 claims description 11
- 229920001187 thermosetting polymer Polymers 0.000 claims description 11
- 150000002170 ethers Chemical class 0.000 claims description 10
- 150000002989 phenols Chemical class 0.000 claims description 9
- 125000001570 methylene group Chemical group [H]C([H])([*:1])[*:2] 0.000 claims description 8
- 125000000816 ethylene group Chemical group [H]C([H])([*:1])C([H])([H])[*:2] 0.000 claims description 7
- 125000002723 alicyclic group Chemical group 0.000 claims description 6
- 125000005110 aryl thio group Chemical group 0.000 claims description 5
- 125000004104 aryloxy group Chemical group 0.000 claims description 5
- 229910052799 carbon Inorganic materials 0.000 claims description 5
- 239000004020 conductor Substances 0.000 claims description 5
- 125000003396 thiol group Chemical group [H]S* 0.000 claims description 5
- 125000003310 benzodiazepinyl group Chemical class N1N=C(C=CC2=C1C=CC=C2)* 0.000 claims description 3
- 125000001183 hydrocarbyl group Chemical group 0.000 claims 4
- 238000010521 absorption reaction Methods 0.000 abstract description 30
- 239000000470 constituent Substances 0.000 abstract 1
- PPBRXRYQALVLMV-UHFFFAOYSA-N Styrene Chemical compound C=CC1=CC=CC=C1 PPBRXRYQALVLMV-UHFFFAOYSA-N 0.000 description 55
- 239000000126 substance Substances 0.000 description 53
- 239000010410 layer Substances 0.000 description 39
- 239000011521 glass Substances 0.000 description 34
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 description 34
- 238000000034 method Methods 0.000 description 31
- 229920002554 vinyl polymer Polymers 0.000 description 30
- 239000003822 epoxy resin Substances 0.000 description 29
- 229920000647 polyepoxide Polymers 0.000 description 29
- 239000002585 base Substances 0.000 description 28
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 25
- 239000000178 monomer Substances 0.000 description 25
- 239000011889 copper foil Substances 0.000 description 24
- 239000002904 solvent Substances 0.000 description 24
- KXGFMDJXCMQABM-UHFFFAOYSA-N 2-methoxy-6-methylphenol Chemical compound [CH]OC1=CC=CC([CH])=C1O KXGFMDJXCMQABM-UHFFFAOYSA-N 0.000 description 23
- 229920001568 phenolic resin Polymers 0.000 description 23
- 239000005011 phenolic resin Substances 0.000 description 23
- UHOVQNZJYSORNB-UHFFFAOYSA-N Benzene Chemical compound C1=CC=CC=C1 UHOVQNZJYSORNB-UHFFFAOYSA-N 0.000 description 22
- 125000000484 butyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 20
- 125000000391 vinyl group Chemical group [H]C([*])=C([H])[H] 0.000 description 19
- 150000002430 hydrocarbons Chemical group 0.000 description 18
- 125000001495 ethyl group Chemical group [H]C([H])([H])C([H])([H])* 0.000 description 17
- 239000003063 flame retardant Substances 0.000 description 17
- 238000003786 synthesis reaction Methods 0.000 description 17
- KAKZBPTYRLMSJV-UHFFFAOYSA-N vinyl-ethylene Natural products C=CC=C KAKZBPTYRLMSJV-UHFFFAOYSA-N 0.000 description 17
- 150000001993 dienes Chemical class 0.000 description 15
- 125000001436 propyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])[H] 0.000 description 15
- 125000005439 maleimidyl group Chemical group C1(C=CC(N1*)=O)=O 0.000 description 14
- 108091081474 miR-5000 stem-loop Proteins 0.000 description 14
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 13
- 125000001046 glycoluril group Chemical group [H]C12N(*)C(=O)N(*)C1([H])N(*)C(=O)N2* 0.000 description 13
- MYRTYDVEIRVNKP-UHFFFAOYSA-N 1,2-Divinylbenzene Chemical compound C=CC1=CC=CC=C1C=C MYRTYDVEIRVNKP-UHFFFAOYSA-N 0.000 description 12
- 125000003342 alkenyl group Chemical group 0.000 description 12
- 238000000576 coating method Methods 0.000 description 12
- 230000000052 comparative effect Effects 0.000 description 12
- 229920001971 elastomer Polymers 0.000 description 12
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 12
- 230000015572 biosynthetic process Effects 0.000 description 11
- IISBACLAFKSPIT-UHFFFAOYSA-N bisphenol A Chemical compound C=1C=C(O)C=CC=1C(C)(C)C1=CC=C(O)C=C1 IISBACLAFKSPIT-UHFFFAOYSA-N 0.000 description 11
- 230000009477 glass transition Effects 0.000 description 11
- 238000004519 manufacturing process Methods 0.000 description 11
- 150000001491 aromatic compounds Chemical class 0.000 description 10
- 150000004945 aromatic hydrocarbons Chemical class 0.000 description 10
- 239000011248 coating agent Substances 0.000 description 10
- 229920003986 novolac Polymers 0.000 description 10
- 238000005530 etching Methods 0.000 description 9
- 238000005227 gel permeation chromatography Methods 0.000 description 9
- 239000011572 manganese Substances 0.000 description 9
- ZUOUZKKEUPVFJK-UHFFFAOYSA-N phenylbenzene Natural products C1=CC=CC=C1C1=CC=CC=C1 ZUOUZKKEUPVFJK-UHFFFAOYSA-N 0.000 description 9
- UFWIBTONFRDIAS-UHFFFAOYSA-N Naphthalene Chemical compound C1=CC=CC2=CC=CC=C21 UFWIBTONFRDIAS-UHFFFAOYSA-N 0.000 description 8
- 239000004305 biphenyl Substances 0.000 description 8
- 239000002270 dispersing agent Substances 0.000 description 8
- 125000000843 phenylene group Chemical group C1(=C(C=CC=C1)*)* 0.000 description 8
- 239000000843 powder Substances 0.000 description 8
- 150000003923 2,5-pyrrolediones Chemical class 0.000 description 7
- ISWSIDIOOBJBQZ-UHFFFAOYSA-N Phenol Chemical compound OC1=CC=CC=C1 ISWSIDIOOBJBQZ-UHFFFAOYSA-N 0.000 description 7
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 7
- 239000006087 Silane Coupling Agent Substances 0.000 description 7
- 235000010290 biphenyl Nutrition 0.000 description 7
- 238000006243 chemical reaction Methods 0.000 description 7
- 229920001577 copolymer Polymers 0.000 description 7
- 230000000694 effects Effects 0.000 description 7
- 239000000806 elastomer Substances 0.000 description 7
- 238000011156 evaluation Methods 0.000 description 7
- 238000005259 measurement Methods 0.000 description 7
- 239000000203 mixture Substances 0.000 description 7
- 229910052698 phosphorus Inorganic materials 0.000 description 7
- 239000011574 phosphorus Substances 0.000 description 7
- 239000000243 solution Substances 0.000 description 7
- RNFJDJUURJAICM-UHFFFAOYSA-N 2,2,4,4,6,6-hexaphenoxy-1,3,5-triaza-2$l^{5},4$l^{5},6$l^{5}-triphosphacyclohexa-1,3,5-triene Chemical compound N=1P(OC=2C=CC=CC=2)(OC=2C=CC=CC=2)=NP(OC=2C=CC=CC=2)(OC=2C=CC=CC=2)=NP=1(OC=1C=CC=CC=1)OC1=CC=CC=C1 RNFJDJUURJAICM-UHFFFAOYSA-N 0.000 description 6
- ZWEHNKRNPOVVGH-UHFFFAOYSA-N 2-Butanone Chemical compound CCC(C)=O ZWEHNKRNPOVVGH-UHFFFAOYSA-N 0.000 description 6
- RRHGJUQNOFWUDK-UHFFFAOYSA-N Isoprene Chemical compound CC(=C)C=C RRHGJUQNOFWUDK-UHFFFAOYSA-N 0.000 description 6
- WNROFYMDJYEPJX-UHFFFAOYSA-K aluminium hydroxide Chemical compound [OH-].[OH-].[OH-].[Al+3] WNROFYMDJYEPJX-UHFFFAOYSA-K 0.000 description 6
- PXKLMJQFEQBVLD-UHFFFAOYSA-N bisphenol F Chemical compound C1=CC(O)=CC=C1CC1=CC=C(O)C=C1 PXKLMJQFEQBVLD-UHFFFAOYSA-N 0.000 description 6
- 238000001035 drying Methods 0.000 description 6
- 239000004744 fabric Substances 0.000 description 6
- 150000002466 imines Chemical class 0.000 description 6
- 238000000465 moulding Methods 0.000 description 6
- VLKZOEOYAKHREP-UHFFFAOYSA-N n-Hexane Chemical compound CCCCCC VLKZOEOYAKHREP-UHFFFAOYSA-N 0.000 description 6
- 230000009467 reduction Effects 0.000 description 6
- 239000002893 slag Substances 0.000 description 6
- 239000000758 substrate Substances 0.000 description 6
- 239000000654 additive Substances 0.000 description 5
- 239000000853 adhesive Substances 0.000 description 5
- 230000001070 adhesive effect Effects 0.000 description 5
- XYLMUPLGERFSHI-UHFFFAOYSA-N alpha-Methylstyrene Chemical compound CC(=C)C1=CC=CC=C1 XYLMUPLGERFSHI-UHFFFAOYSA-N 0.000 description 5
- 238000009835 boiling Methods 0.000 description 5
- 125000004122 cyclic group Chemical group 0.000 description 5
- 238000011161 development Methods 0.000 description 5
- 230000018109 developmental process Effects 0.000 description 5
- 238000011049 filling Methods 0.000 description 5
- 239000005060 rubber Substances 0.000 description 5
- 239000002356 single layer Substances 0.000 description 5
- 230000008961 swelling Effects 0.000 description 5
- JLBJTVDPSNHSKJ-UHFFFAOYSA-N 4-Methylstyrene Chemical compound CC1=CC=C(C=C)C=C1 JLBJTVDPSNHSKJ-UHFFFAOYSA-N 0.000 description 4
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 4
- ZMXDDKWLCZADIW-UHFFFAOYSA-N N,N-Dimethylformamide Chemical compound CN(C)C=O ZMXDDKWLCZADIW-UHFFFAOYSA-N 0.000 description 4
- 229910019142 PO4 Inorganic materials 0.000 description 4
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 4
- NIXOWILDQLNWCW-UHFFFAOYSA-N acrylic acid group Chemical group C(C=C)(=O)O NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 description 4
- 125000004414 alkyl thio group Chemical group 0.000 description 4
- 125000002947 alkylene group Chemical group 0.000 description 4
- MWPLVEDNUUSJAV-UHFFFAOYSA-N anthracene Chemical compound C1=CC=CC2=CC3=CC=CC=C3C=C21 MWPLVEDNUUSJAV-UHFFFAOYSA-N 0.000 description 4
- MPMBRWOOISTHJV-UHFFFAOYSA-N but-1-enylbenzene Chemical compound CCC=CC1=CC=CC=C1 MPMBRWOOISTHJV-UHFFFAOYSA-N 0.000 description 4
- 238000007334 copolymerization reaction Methods 0.000 description 4
- 150000002148 esters Chemical class 0.000 description 4
- LZCLXQDLBQLTDK-UHFFFAOYSA-N ethyl 2-hydroxypropanoate Chemical compound CCOC(=O)C(C)O LZCLXQDLBQLTDK-UHFFFAOYSA-N 0.000 description 4
- 125000005647 linker group Chemical group 0.000 description 4
- 238000002156 mixing Methods 0.000 description 4
- NBIIXXVUZAFLBC-UHFFFAOYSA-K phosphate Chemical compound [O-]P([O-])([O-])=O NBIIXXVUZAFLBC-UHFFFAOYSA-K 0.000 description 4
- 239000010452 phosphate Substances 0.000 description 4
- 239000003495 polar organic solvent Substances 0.000 description 4
- 238000006116 polymerization reaction Methods 0.000 description 4
- 229920001296 polysiloxane Polymers 0.000 description 4
- 229910000077 silane Inorganic materials 0.000 description 4
- 238000006467 substitution reaction Methods 0.000 description 4
- 230000003746 surface roughness Effects 0.000 description 4
- 238000012360 testing method Methods 0.000 description 4
- 239000002966 varnish Substances 0.000 description 4
- KOMNUTZXSVSERR-UHFFFAOYSA-N 1,3,5-tris(prop-2-enyl)-1,3,5-triazinane-2,4,6-trione Chemical compound C=CCN1C(=O)N(CC=C)C(=O)N(CC=C)C1=O KOMNUTZXSVSERR-UHFFFAOYSA-N 0.000 description 3
- XQUPVDVFXZDTLT-UHFFFAOYSA-N 1-[4-[[4-(2,5-dioxopyrrol-1-yl)phenyl]methyl]phenyl]pyrrole-2,5-dione Chemical compound O=C1C=CC(=O)N1C(C=C1)=CC=C1CC1=CC=C(N2C(C=CC2=O)=O)C=C1 XQUPVDVFXZDTLT-UHFFFAOYSA-N 0.000 description 3
- PAOHAQSLJSMLAT-UHFFFAOYSA-N 1-butylperoxybutane Chemical group CCCCOOCCCC PAOHAQSLJSMLAT-UHFFFAOYSA-N 0.000 description 3
- HECLRDQVFMWTQS-RGOKHQFPSA-N 1755-01-7 Chemical compound C1[C@H]2[C@@H]3CC=C[C@@H]3[C@@H]1C=C2 HECLRDQVFMWTQS-RGOKHQFPSA-N 0.000 description 3
- YBYIRNPNPLQARY-UHFFFAOYSA-N 1H-indene Natural products C1=CC=C2CC=CC2=C1 YBYIRNPNPLQARY-UHFFFAOYSA-N 0.000 description 3
- QTWJRLJHJPIABL-UHFFFAOYSA-N 2-methylphenol;3-methylphenol;4-methylphenol Chemical compound CC1=CC=C(O)C=C1.CC1=CC=CC(O)=C1.CC1=CC=CC=C1O QTWJRLJHJPIABL-UHFFFAOYSA-N 0.000 description 3
- VPWNQTHUCYMVMZ-UHFFFAOYSA-N 4,4'-sulfonyldiphenol Chemical compound C1=CC(O)=CC=C1S(=O)(=O)C1=CC=C(O)C=C1 VPWNQTHUCYMVMZ-UHFFFAOYSA-N 0.000 description 3
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 3
- 239000005995 Aluminium silicate Substances 0.000 description 3
- 229910052582 BN Inorganic materials 0.000 description 3
- PZNSFCLAULLKQX-UHFFFAOYSA-N Boron nitride Chemical compound N#B PZNSFCLAULLKQX-UHFFFAOYSA-N 0.000 description 3
- XEKOWRVHYACXOJ-UHFFFAOYSA-N Ethyl acetate Chemical compound CCOC(C)=O XEKOWRVHYACXOJ-UHFFFAOYSA-N 0.000 description 3
- PEEHTFAAVSWFBL-UHFFFAOYSA-N Maleimide Chemical compound O=C1NC(=O)C=C1 PEEHTFAAVSWFBL-UHFFFAOYSA-N 0.000 description 3
- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 description 3
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 3
- ZMANZCXQSJIPKH-UHFFFAOYSA-N Triethylamine Chemical compound CCN(CC)CC ZMANZCXQSJIPKH-UHFFFAOYSA-N 0.000 description 3
- 150000001252 acrylic acid derivatives Chemical class 0.000 description 3
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 3
- 235000012211 aluminium silicate Nutrition 0.000 description 3
- 125000004429 atom Chemical group 0.000 description 3
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 3
- 229910001593 boehmite Inorganic materials 0.000 description 3
- 150000001735 carboxylic acids Chemical class 0.000 description 3
- 239000003795 chemical substances by application Substances 0.000 description 3
- 239000002131 composite material Substances 0.000 description 3
- 229930003836 cresol Natural products 0.000 description 3
- 238000001723 curing Methods 0.000 description 3
- 230000007423 decrease Effects 0.000 description 3
- 150000001990 dicarboxylic acid derivatives Chemical class 0.000 description 3
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- 239000012776 electronic material Substances 0.000 description 3
- 229910052731 fluorine Inorganic materials 0.000 description 3
- 229910052839 forsterite Inorganic materials 0.000 description 3
- 239000003365 glass fiber Substances 0.000 description 3
- 238000010438 heat treatment Methods 0.000 description 3
- 238000004128 high performance liquid chromatography Methods 0.000 description 3
- 238000005984 hydrogenation reaction Methods 0.000 description 3
- FAHBNUUHRFUEAI-UHFFFAOYSA-M hydroxidooxidoaluminium Chemical compound O[Al]=O FAHBNUUHRFUEAI-UHFFFAOYSA-M 0.000 description 3
- 150000002460 imidazoles Chemical class 0.000 description 3
- 239000011256 inorganic filler Substances 0.000 description 3
- 229910003475 inorganic filler Inorganic materials 0.000 description 3
- ZFSLODLOARCGLH-UHFFFAOYSA-N isocyanuric acid Chemical group OC1=NC(O)=NC(O)=N1 ZFSLODLOARCGLH-UHFFFAOYSA-N 0.000 description 3
- 125000001449 isopropyl group Chemical group [H]C([H])([H])C([H])(*)C([H])([H])[H] 0.000 description 3
- NLYAJNPCOHFWQQ-UHFFFAOYSA-N kaolin Chemical compound O.O.O=[Al]O[Si](=O)O[Si](=O)O[Al]=O NLYAJNPCOHFWQQ-UHFFFAOYSA-N 0.000 description 3
- 239000007788 liquid Substances 0.000 description 3
- HCWCAKKEBCNQJP-UHFFFAOYSA-N magnesium orthosilicate Chemical compound [Mg+2].[Mg+2].[O-][Si]([O-])([O-])[O-] HCWCAKKEBCNQJP-UHFFFAOYSA-N 0.000 description 3
- 125000005395 methacrylic acid group Chemical group 0.000 description 3
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- 239000000454 talc Substances 0.000 description 3
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- 229920001567 vinyl ester resin Polymers 0.000 description 3
- UKRDPEFKFJNXQM-UHFFFAOYSA-N vinylsilane Chemical class [SiH3]C=C UKRDPEFKFJNXQM-UHFFFAOYSA-N 0.000 description 3
- HGTUJZTUQFXBIH-UHFFFAOYSA-N (2,3-dimethyl-3-phenylbutan-2-yl)benzene Chemical group C=1C=CC=CC=1C(C)(C)C(C)(C)C1=CC=CC=C1 HGTUJZTUQFXBIH-UHFFFAOYSA-N 0.000 description 2
- JSNRRGGBADWTMC-UHFFFAOYSA-N (6E)-7,11-dimethyl-3-methylene-1,6,10-dodecatriene Chemical compound CC(C)=CCCC(C)=CCCC(=C)C=C JSNRRGGBADWTMC-UHFFFAOYSA-N 0.000 description 2
- 125000000349 (Z)-3-carboxyprop-2-enoyl group Chemical group O=C([*])/C([H])=C([H])\C(O[H])=O 0.000 description 2
- HCNHNBLSNVSJTJ-UHFFFAOYSA-N 1,1-Bis(4-hydroxyphenyl)ethane Chemical compound C=1C=C(O)C=CC=1C(C)C1=CC=C(O)C=C1 HCNHNBLSNVSJTJ-UHFFFAOYSA-N 0.000 description 2
- IYSVFZBXZVPIFA-UHFFFAOYSA-N 1-ethenyl-4-(4-ethenylphenyl)benzene Chemical group C1=CC(C=C)=CC=C1C1=CC=C(C=C)C=C1 IYSVFZBXZVPIFA-UHFFFAOYSA-N 0.000 description 2
- PAMIQIKDUOTOBW-UHFFFAOYSA-N 1-methylpiperidine Chemical compound CN1CCCCC1 PAMIQIKDUOTOBW-UHFFFAOYSA-N 0.000 description 2
- KJCVRFUGPWSIIH-UHFFFAOYSA-N 1-naphthol Chemical compound C1=CC=C2C(O)=CC=CC2=C1 KJCVRFUGPWSIIH-UHFFFAOYSA-N 0.000 description 2
- RCJMVGJKROQDCB-UHFFFAOYSA-N 2-methylpenta-1,3-diene Chemical compound CC=CC(C)=C RCJMVGJKROQDCB-UHFFFAOYSA-N 0.000 description 2
- KUDUQBURMYMBIJ-UHFFFAOYSA-N 2-prop-2-enoyloxyethyl prop-2-enoate Chemical compound C=CC(=O)OCCOC(=O)C=C KUDUQBURMYMBIJ-UHFFFAOYSA-N 0.000 description 2
- OMIHGPLIXGGMJB-UHFFFAOYSA-N 7-oxabicyclo[4.1.0]hepta-1,3,5-triene Chemical class C1=CC=C2OC2=C1 OMIHGPLIXGGMJB-UHFFFAOYSA-N 0.000 description 2
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- 229920002430 Fibre-reinforced plastic Polymers 0.000 description 2
- CERQOIWHTDAKMF-UHFFFAOYSA-N Methacrylic acid Chemical group CC(=C)C(O)=O CERQOIWHTDAKMF-UHFFFAOYSA-N 0.000 description 2
- JLTDJTHDQAWBAV-UHFFFAOYSA-N N,N-dimethylaniline Chemical compound CN(C)C1=CC=CC=C1 JLTDJTHDQAWBAV-UHFFFAOYSA-N 0.000 description 2
- 239000004793 Polystyrene Substances 0.000 description 2
- QOSMNYMQXIVWKY-UHFFFAOYSA-N Propyl levulinate Chemical compound CCCOC(=O)CCC(C)=O QOSMNYMQXIVWKY-UHFFFAOYSA-N 0.000 description 2
- JUJWROOIHBZHMG-UHFFFAOYSA-N Pyridine Chemical compound C1=CC=NC=C1 JUJWROOIHBZHMG-UHFFFAOYSA-N 0.000 description 2
- SMWDFEZZVXVKRB-UHFFFAOYSA-N Quinoline Chemical compound N1=CC=CC2=CC=CC=C21 SMWDFEZZVXVKRB-UHFFFAOYSA-N 0.000 description 2
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical group [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- UIIMBOGNXHQVGW-UHFFFAOYSA-M Sodium bicarbonate Chemical compound [Na+].OC([O-])=O UIIMBOGNXHQVGW-UHFFFAOYSA-M 0.000 description 2
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- 150000003606 tin compounds Chemical class 0.000 description 1
- HPGGPRDJHPYFRM-UHFFFAOYSA-J tin(iv) chloride Chemical compound Cl[Sn](Cl)(Cl)Cl HPGGPRDJHPYFRM-UHFFFAOYSA-J 0.000 description 1
- 239000004408 titanium dioxide Substances 0.000 description 1
- IMFACGCPASFAPR-UHFFFAOYSA-N tributylamine Chemical compound CCCCN(CCCC)CCCC IMFACGCPASFAPR-UHFFFAOYSA-N 0.000 description 1
- 125000002023 trifluoromethyl group Chemical group FC(F)(F)* 0.000 description 1
- BPSIOYPQMFLKFR-UHFFFAOYSA-N trimethoxy-[3-(oxiran-2-ylmethoxy)propyl]silane Chemical compound CO[Si](OC)(OC)CCCOCC1CO1 BPSIOYPQMFLKFR-UHFFFAOYSA-N 0.000 description 1
- XZZNDPSIHUTMOC-UHFFFAOYSA-N triphenyl phosphate Chemical compound C=1C=CC=CC=1OP(OC=1C=CC=CC=1)(=O)OC1=CC=CC=C1 XZZNDPSIHUTMOC-UHFFFAOYSA-N 0.000 description 1
- CAPOZRICGSDRLP-UHFFFAOYSA-N tris(2,3-dimethylphenyl) phosphate Chemical compound CC1=CC=CC(OP(=O)(OC=2C(=C(C)C=CC=2)C)OC=2C(=C(C)C=CC=2)C)=C1C CAPOZRICGSDRLP-UHFFFAOYSA-N 0.000 description 1
- 229940116269 uric acid Drugs 0.000 description 1
- 238000009736 wetting Methods 0.000 description 1
- 239000002759 woven fabric Substances 0.000 description 1
- 239000008096 xylene Substances 0.000 description 1
- 125000002256 xylenyl group Chemical class C1(C(C=CC=C1)C)(C)* 0.000 description 1
- 239000011701 zinc Substances 0.000 description 1
- 229910052725 zinc Inorganic materials 0.000 description 1
- 239000011592 zinc chloride Substances 0.000 description 1
- 235000005074 zinc chloride Nutrition 0.000 description 1
- 239000011787 zinc oxide Substances 0.000 description 1
- XAEWLETZEZXLHR-UHFFFAOYSA-N zinc;dioxido(dioxo)molybdenum Chemical compound [Zn+2].[O-][Mo]([O-])(=O)=O XAEWLETZEZXLHR-UHFFFAOYSA-N 0.000 description 1
- BNEMLSQAJOPTGK-UHFFFAOYSA-N zinc;dioxido(oxo)tin Chemical compound [Zn+2].[O-][Sn]([O-])=O BNEMLSQAJOPTGK-UHFFFAOYSA-N 0.000 description 1
- CHJMFFKHPHCQIJ-UHFFFAOYSA-L zinc;octanoate Chemical compound [Zn+2].CCCCCCCC([O-])=O.CCCCCCCC([O-])=O CHJMFFKHPHCQIJ-UHFFFAOYSA-L 0.000 description 1
- 229910001928 zirconium oxide Inorganic materials 0.000 description 1
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B15/00—Layered products comprising a layer of metal
- B32B15/04—Layered products comprising a layer of metal comprising metal as the main or only constituent of a layer, which is next to another layer of the same or of a different material
- B32B15/08—Layered products comprising a layer of metal comprising metal as the main or only constituent of a layer, which is next to another layer of the same or of a different material of synthetic resin
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08F—MACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
- C08F299/00—Macromolecular compounds obtained by interreacting polymers involving only carbon-to-carbon unsaturated bond reactions, in the absence of non-macromolecular monomers
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08J—WORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
- C08J5/00—Manufacture of articles or shaped materials containing macromolecular substances
- C08J5/24—Impregnating materials with prepolymers which can be polymerised in situ, e.g. manufacture of prepregs
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L101/00—Compositions of unspecified macromolecular compounds
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L25/00—Compositions of, homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by an aromatic carbocyclic ring; Compositions of derivatives of such polymers
- C08L25/02—Homopolymers or copolymers of hydrocarbons
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L39/00—Compositions of homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by a single or double bond to nitrogen or by a heterocyclic ring containing nitrogen; Compositions of derivatives of such polymers
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/03—Use of materials for the substrate
Landscapes
- Chemical & Material Sciences (AREA)
- Health & Medical Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Medicinal Chemistry (AREA)
- Polymers & Plastics (AREA)
- Organic Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Reinforced Plastic Materials (AREA)
- Addition Polymer Or Copolymer, Post-Treatments, Or Chemical Modifications (AREA)
Abstract
Description
本發明關於樹脂組成物、硬化物、預浸體、覆金屬箔疊層板、樹脂複合片、印刷配線板、及半導體裝置。The present invention relates to a resin composition, a cured product, a prepreg, a metal foil-clad laminate, a resin composite sheet, a printed wiring board, and a semiconductor device.
近年,以可攜式終端為代表,電子設備、通信設備等所使用的半導體元件之高積體化及微細化正在加速。伴隨於此,正尋求能進行半導體元件之高密度安裝的技術,針對其佔重要位置之印刷配線板亦尋求改良。 另一方面,電子設備等的用途正多樣化並逐漸擴大。因此,印刷配線板或其使用的覆金屬箔疊層板、預浸體等所要求的諸特性亦正多樣化,且愈趨嚴格。為了得到考慮的如此的要求特性且同時已改善的印刷配線板,已有人提出各種材料、加工法。就其中1種而言,可列舉構成預浸體、樹脂複合片之樹脂材料的改良開發。 In recent years, semiconductor devices used in electronic equipment, communication equipment, etc., represented by portable terminals, have become highly integrated and miniaturized. Along with this, technologies that enable high-density mounting of semiconductor elements are being sought, and improvements are also being sought on printed wiring boards that occupy an important position. On the other hand, the uses of electronic equipment and the like are diversifying and expanding. Therefore, the various properties required for printed wiring boards, metal foil-clad laminates, prepregs, etc. used therefor are also diversifying and becoming more stringent. In order to obtain a printed wiring board that is improved in consideration of such required characteristics, various materials and processing methods have been proposed. One of them is the improvement and development of resin materials constituting prepregs and resin composite sheets.
又,專利文獻1揭示如下述所示之馬來醯亞胺樹脂作為適於電子材料用途之馬來醯亞胺樹脂。此外,專利文獻1揭示和環氧樹脂等進行摻混而成的硬化性樹脂組成物,其介電特性優良。又,專利文獻2亦記載下述化合物。 [化1] [先前技術文獻] [專利文獻] Furthermore, Patent Document 1 discloses a maleimide resin as shown below as a maleimide resin suitable for electronic material applications. In addition, Patent Document 1 discloses a curable resin composition blended with an epoxy resin or the like, which has excellent dielectric properties. Furthermore, Patent Document 2 also describes the following compounds. [Chemical 1] [Prior art documents] [Patent documents]
[專利文獻1]國際公開第2020/054601號 [專利文獻2]國際公開第2021/182360號 [Patent Document 1] International Publication No. 2020/054601 [Patent Document 2] International Publication No. 2021/182360
[發明所欲解決之課題][Problem to be solved by the invention]
如上所述,電子設備等之用途正多樣化且逐漸擴大,針對構成預浸體等之樹脂材料亦尋求新的材質。尤其,針對維持優良的低介電特性(Dk及/或Df)同時吸濕耐熱性優良的樹脂組成物,尋求更進一步的材料開發。 本發明為了解決上述課題,目的為提供維持優良的低介電特性(Dk及/或Df)同時吸濕耐熱性優良的樹脂組成物,以及提供硬化物、預浸體、覆金屬箔疊層板、樹脂複合片、印刷配線板、及半導體裝置。 [解決課題之手段] As mentioned above, the uses of electronic devices and the like are diversifying and expanding, and new materials are being sought for resin materials constituting prepregs and the like. In particular, further material development is sought for a resin composition that maintains excellent low dielectric properties (Dk and/or Df) and has excellent moisture absorption and heat resistance. In order to solve the above-mentioned problems, the object of the present invention is to provide a resin composition that maintains excellent low dielectric properties (Dk and/or Df) and has excellent moisture absorption and heat resistance, and to provide a cured product, a prepreg, and a metal foil-clad laminate. , resin composite sheets, printed wiring boards, and semiconductor devices. [Means to solve the problem]
基於上述課題,本案發明人進行探討後之結果發現,藉由合併使用預定的馬來醯亞胺化合物和預定的多官能乙烯基芳香族聚合物,能解決上述課題。 具體而言,係利用下述手段解決了上述課題。 <1>一種樹脂組成物,含有: 式(M)表示之化合物(M), 具有式(V)表示之構成單元的聚合物(V),及 式(M1)表示之化合物(M1)。 [化2] 式(M)中,R分別獨立地表示也可被鹵素原子取代之碳數1~10之烴基,R mx分別獨立地為亞甲基、亞乙基、或2,2-亞丙基,R my為選自下述群(A)之基。m表示0~3之整數,n為重複數之平均值,且表示1.00≦n≦20.00。 (群(A)) [化3] 群(A)中,R y分別獨立地為碳數1~4之烷基、碳數1~4之烷氧基、或也可具有取代基之苯基,ny分別獨立地為0~3之整數,*為和R mx之鍵結位置。 [化4] 式(V)中,Ar表示芳香族烴連結基。*表示鍵結位置。 [化5] 式(M1)中,R M1、R M2、R M3及R M4分別獨立地表示氫原子或有機基。R M5及R M6分別獨立地表示氫原子或烷基。Ar M表示2價芳香族基。A為4~6員環之脂環基。R M7及R M8分別獨立地為烷基。mx為1或2,lx為0或1。R M9及R M10分別獨立地表示氫原子或烷基。R M11、R M12、R M13及R M14分別獨立地表示氫原子或有機基。R M15分別獨立地表示碳數1~10之烷基、碳數1~10之烷基氧基、碳數1~10之烷基硫代基、碳數6~10之芳基、碳數6~10之芳氧基、碳數6~10之芳基硫代基、鹵素原子、羥基或巰基。px表示0~3之整數。nx表示1~20之整數。 <2>如<1>所記載之樹脂組成物,其中,前述式(M)表示之化合物(M)相對於前述樹脂組成物中的樹脂固體成分100質量份之含量為5~50質量份。 <3>如<1>或<2>所記載之樹脂組成物,其中,前述具有式(V)表示之構成單元的聚合物(V)相對於前述樹脂組成物中的樹脂固體成分100質量份之含量為5~50質量份。 <4>如<1>~<3>中任一項所記載之樹脂組成物,其中,前述式(M1)表示之化合物(M1)相對於前述樹脂組成物中的樹脂固體成分100質量份之含量為5~50質量份。 <5>如<1>~<4>中任一項所記載之樹脂組成物,其中,前述式(M)表示之化合物(M)中,n為1.05≦n≦20.00。 <6>如<1>~<5>中任一項所記載之樹脂組成物,其中,前述式(M)表示之化合物(M)包含式(M-1)表示之化合物。 [化6] 式(M-1)中,R分別獨立地表示也可被鹵素原子取代之碳數1~10之烴基。m表示0~3之整數,n為重複數之平均值,且表示1.00≦n≦20.00。 <7>如<1>~<6>中任一項所記載之樹脂組成物,其中,前述式(M)表示之化合物(M)包含式(M-2)表示之化合物。 [化7] 式(M-2)中,R z分別獨立地表示碳數1~10之烴基。m表示0~3之整數,n為重複數之平均值,且表示1.00≦n≦20.00。 <8>如<1>~<7>中任一項所記載之樹脂組成物,其中,前述具有式(V)表示之構成單元的聚合物(V)的重量平均分子量為3,000~130,000。 <9>如<1>~<8>中任一項所記載之樹脂組成物,其中,前述具有式(V)表示之構成單元的聚合物(V)的重量平均分子量為10,000~130,000。 <10>如<1>~<9>中任一項所記載之樹脂組成物,更含有選自由前述式(M)表示之化合物(M)及前述式(M1)表示之化合物(M1)以外的馬來醯亞胺化合物、環氧化合物、酚化合物、氧雜環丁烷樹脂、苯并㗁𠯤化合物、含有(甲基)烯丙基之化合物(宜為烯基納迪克醯亞胺化合物)、及含有2個以上之碳-碳不飽和雙鍵之聚苯醚化合物構成之群組中之1種以上之其它熱硬化性化合物(C)。 <11>如<10>所記載之樹脂組成物,其中,前述其它熱硬化性化合物(C)相對於前述樹脂組成物中的樹脂固體成分100質量份之含量為1~50質量份。 <12>如<1>~<11>中任一項所記載之樹脂組成物,更含有填充材(D)。 <13>如<12>所記載之樹脂組成物,其中,前述樹脂組成物中的前述填充材(D)之含量相對於樹脂固體成分100質量份,為10~1600質量份。 <14>如<1>~<13>中任一項所記載之樹脂組成物,更含有熱塑性彈性體。 <15>如<1>~<14>中任一項所記載之樹脂組成物,其中, 前述式(M)表示之化合物(M)相對於前述樹脂組成物中的樹脂固體成分100質量份之含量為5~50質量份, 前述具有式(V)表示之構成單元的聚合物(V)相對於前述樹脂組成物中的樹脂固體成分100質量份之含量為5~50質量份, 前述式(M1)表示之化合物(M1)相對於前述樹脂組成物中的樹脂固體成分100質量份之含量為5~50質量份, 前述式(M)表示之化合物(M)包含式(M-1)表示之化合物,且n為1.05≦n≦20.00, 前述具有式(V)表示之構成單元的聚合物(V)的重量平均分子量為3,000~130,000。 [化8] 式(M-1)中,R分別獨立地表示也可被鹵素原子取代之碳數1~10之烴基。m表示0~3之整數,n為重複數之平均值,且表示1.00≦n≦20.00。 <16>一種硬化物,係如<1>~<15>中任一項所記載之樹脂組成物的硬化物。 <17>一種預浸體,係由基材、及如<1>~<15>中任一項所記載之樹脂組成物形成之預浸體。 <18>一種覆金屬箔疊層板,含有: 由如<17>所記載之預浸體形成之至少1層,及 配置於由前述預浸體形成之層的單面或雙面之金屬箔。 <19>一種樹脂複合片,含有: 支持體,及 配置於前述支持體的表面之由如<1>~<15>中任一項所記載之樹脂組成物形成之層。 <20>一種印刷配線板,含有絕緣層、及配置於前述絕緣層之表面的導體層,前述絕緣層含有由<1>~<15>中任一項所記載之樹脂組成物形成之層的至少一者。 <21>一種半導體裝置,含有如<20>所記載之印刷配線板。 [發明之效果] Based on the above-mentioned problems, the inventors of the present invention conducted research and found that the above-mentioned problems can be solved by using a predetermined maleimide compound and a predetermined polyfunctional vinyl aromatic polymer in combination. Specifically, the above-mentioned problems were solved using the following means. <1> A resin composition containing: a compound (M) represented by formula (M), a polymer (V) having a structural unit represented by formula (V), and a compound (M1) represented by formula (M1). [Chemicalization 2] In the formula (M), R each independently represents a hydrocarbon group with 1 to 10 carbon atoms that may be substituted by a halogen atom, R mx each independently represents a methylene group, an ethylene group, or a 2,2-propylene group, and R my is a base selected from the following group (A). m represents an integer from 0 to 3, n is the average of repeated numbers, and represents 1.00≦n≦20.00. (Group (A)) [Chemicalization 3] In group (A), R y is each independently an alkyl group having 1 to 4 carbon atoms, an alkoxy group having 1 to 4 carbon atoms, or a phenyl group which may have a substituent, and ny is each independently an alkyl group having 0 to 3 carbon atoms. Integer, * is the bonding position with R mx . [Chemical 4] In formula (V), Ar represents an aromatic hydrocarbon connecting group. *Indicates bonding position. [Chemistry 5] In formula (M1), R M1 , R M2 , R M3 and R M4 each independently represent a hydrogen atom or an organic group. R M5 and R M6 each independently represent a hydrogen atom or an alkyl group. Ar M represents a divalent aromatic group. A is an alicyclic group with 4 to 6 members. R M7 and R M8 are each independently an alkyl group. mx is 1 or 2, lx is 0 or 1. R M9 and R M10 each independently represent a hydrogen atom or an alkyl group. RM11 , RM12 , RM13 and RM14 each independently represent a hydrogen atom or an organic group. R M15 independently represents an alkyl group having 1 to 10 carbon atoms, an alkyloxy group having 1 to 10 carbon atoms, an alkylthio group having 1 to 10 carbon atoms, an aryl group having 6 to 10 carbon atoms, or an aryl group having 6 carbon atoms. An aryloxy group with ∼10 carbon atoms, an arylthio group with 6 to 10 carbon atoms, a halogen atom, a hydroxyl group or a mercapto group. px represents an integer from 0 to 3. nx represents an integer from 1 to 20. <2> The resin composition according to <1>, wherein the content of the compound (M) represented by the formula (M) is 5 to 50 parts by mass relative to 100 parts by mass of the resin solid content in the resin composition. <3> The resin composition according to <1> or <2>, wherein the polymer (V) having the structural unit represented by formula (V) is 100 parts by mass of the resin solid content in the resin composition. The content is 5 to 50 parts by mass. <4> The resin composition according to any one of <1> to <3>, wherein the compound (M1) represented by the formula (M1) is 100 parts by mass of the resin solid content in the resin composition. The content is 5 to 50 parts by mass. <5> The resin composition according to any one of <1> to <4>, wherein n is 1.05≦n≦20.00 in the compound (M) represented by the formula (M). <6> The resin composition according to any one of <1> to <5>, wherein the compound (M) represented by the formula (M) includes a compound represented by the formula (M-1). [Chemical 6] In the formula (M-1), R each independently represents a hydrocarbon group having 1 to 10 carbon atoms which may be substituted by a halogen atom. m represents an integer from 0 to 3, n is the average of repeated numbers, and represents 1.00≦n≦20.00. <7> The resin composition according to any one of <1> to <6>, wherein the compound (M) represented by the formula (M) includes the compound represented by the formula (M-2). [Chemical 7] In formula (M-2), Rz each independently represents a hydrocarbon group having 1 to 10 carbon atoms. m represents an integer from 0 to 3, n is the average of repeated numbers, and represents 1.00≦n≦20.00. <8> The resin composition according to any one of <1> to <7>, wherein the weight average molecular weight of the polymer (V) having the structural unit represented by the formula (V) is 3,000 to 130,000. <9> The resin composition according to any one of <1> to <8>, wherein the weight average molecular weight of the polymer (V) having the structural unit represented by the formula (V) is 10,000 to 130,000. <10> The resin composition according to any one of <1> to <9>, further containing a compound (M) selected from the compound (M) represented by the aforementioned formula (M) and a compound (M1) represented by the aforementioned formula (M1). Maleimide compounds, epoxy compounds, phenolic compounds, oxetane resins, benzodiazepine compounds, compounds containing (meth)allyl groups (preferably alkenyl nadicide imine compounds) , and one or more other thermosetting compounds (C) in the group consisting of polyphenylene ether compounds containing two or more carbon-carbon unsaturated double bonds. <11> The resin composition according to <10>, wherein the content of the other thermosetting compound (C) is 1 to 50 parts by mass relative to 100 parts by mass of the resin solid content in the resin composition. <12> The resin composition according to any one of <1> to <11>, further containing a filler (D). <13> The resin composition according to <12>, wherein the content of the filler (D) in the resin composition is 10 to 1,600 parts by mass relative to 100 parts by mass of the resin solid content. <14> The resin composition according to any one of <1> to <13>, further containing a thermoplastic elastomer. <15> The resin composition according to any one of <1> to <14>, wherein the compound (M) represented by the formula (M) is 100 parts by mass of the resin solid content in the resin composition. The content is 5 to 50 parts by mass, and the content of the polymer (V) having the structural unit represented by formula (V) is 5 to 50 parts by mass relative to 100 parts by mass of the resin solid content in the resin composition, and the aforementioned formula (V) is 5 to 50 parts by mass. The content of the compound (M1) represented by M1) is 5 to 50 parts by mass relative to 100 parts by mass of the resin solid content in the aforementioned resin composition, and the compound (M) represented by the aforementioned formula (M) includes the compound represented by the formula (M-1) The compound, and n is 1.05≦n≦20.00, and the weight average molecular weight of the polymer (V) having the structural unit represented by the formula (V) is 3,000 to 130,000. [Chemical 8] In the formula (M-1), R each independently represents a hydrocarbon group having 1 to 10 carbon atoms which may be substituted by a halogen atom. m represents an integer from 0 to 3, n is the average of repeated numbers, and represents 1.00≦n≦20.00. <16> A cured product is a cured product of the resin composition according to any one of <1> to <15>. <17> A prepreg composed of a base material and the resin composition according to any one of <1> to <15>. <18> A metal foil-clad laminate comprising: at least one layer made of the prepreg according to <17>, and a single-sided or double-sided metal foil disposed on the layer made of the prepreg. . <19> A resin composite sheet including: a support, and a layer formed of the resin composition according to any one of <1> to <15> arranged on the surface of the support. <20> A printed wiring board including an insulating layer and a conductor layer disposed on the surface of the insulating layer, the insulating layer including a layer made of the resin composition according to any one of <1> to <15> At least one. <21> A semiconductor device including the printed wiring board according to <20>. [Effects of the invention]
根據本發明,可提供維持優良的低介電特性(Dk及/或Df),同時吸濕耐熱性優良的樹脂組成物,以及可提供硬化物、預浸體、覆金屬箔疊層板、樹脂複合片、印刷配線板、及半導體裝置。According to the present invention, it is possible to provide a resin composition that maintains excellent low dielectric properties (Dk and/or Df) and has excellent moisture absorption and heat resistance, and to provide cured products, prepregs, metal foil-clad laminates, and resins. Composite sheets, printed wiring boards, and semiconductor devices.
以下,針對用以實施本發明之形態(以下簡稱「本實施形態」)進行詳細地說明。另外,下列本實施形態係用以說明本發明之例示,本發明不限於僅為本實施形態。 另外,本說明書中「~」係以包含其前後所記載的數值作為下限值及上限值之涵義而予以使用。 本說明書中,各種物性值及特性值只要不特別敘明,則設為於23℃時者。 本說明書中的基(原子團)之標示中,未記載取代及無取代之標示係包含不具有取代基之基(原子團)以及亦包含具有取代基之基(原子團)。例如,「烷基」不僅包含不具有取代基之烷基(無取代烷基),亦包含具有取代基之烷基(取代烷基)。本說明書中,未記載取代及無取代之標示,為無取代者較理想。 本說明書中,相對介電常數表示物質之介電常數相對於其在真空中的介電常數之比。又,本說明書中,有時將相對介電常數簡稱為「介電常數」。 本說明書中,「(甲基)丙烯酸基」表示丙烯酸基及甲基丙烯酸基之兩者或任一者。「(甲基)烯丙基」表示烯丙基及甲基烯丙基之兩者或任一者。 本說明書所例示之標準依年度有時會有測定方法等不同的情況,只要不特別敘明,則設為基於2022年1月1日時的標準。 Hereinafter, a mode for implementing the present invention (hereinafter referred to as "this embodiment") will be described in detail. In addition, the following embodiment is an illustration for explaining the present invention, and the present invention is not limited to only this embodiment. In addition, "~" in this specification is used in the meaning including the numerical value described before and after it as a lower limit value and an upper limit value. In this specification, various physical property values and characteristic values are assumed to be at 23°C unless otherwise stated. In the indications of groups (atomic groups) in this specification, indications that do not describe substitution or unsubstitution include groups (atomic groups) without substituents and groups (atomic groups) with substituents. For example, "alkyl" includes not only an alkyl group having no substituent (unsubstituted alkyl group) but also an alkyl group having a substituent (substituted alkyl group). In this specification, there is no indication of substitution or non-substitution, and the non-substitution is preferred. In this specification, the relative dielectric constant indicates the ratio of the dielectric constant of a substance to its dielectric constant in a vacuum. In addition, in this specification, the relative dielectric constant may be simply referred to as "dielectric constant". In this specification, "(meth)acrylic acid group" means both or any one of an acrylic acid group and a methacrylic acid group. "(Meth)allyl" represents both or any one of allyl and metallyl. The standards illustrated in this manual may have different measurement methods depending on the year. Unless otherwise stated, they are based on the standards as of January 1, 2022.
本說明書中,馬來醯亞胺基係指下述表示之基。 [化9] 式中,A分別獨立地為氫原子、或碳數1~4之直鏈狀或分支狀之烷基。*為和其它部位之鍵結位置。 A考慮理想地硬化之觀點,兩者皆為氫原子較理想。 烷基的碳數考慮理想地硬化之觀點,宜為1~3,為1~2更佳。 In this specification, the maleimide group refers to the group represented below. [Chemical 9] In the formula, A is independently a hydrogen atom or a linear or branched alkyl group having 1 to 4 carbon atoms. * is the bonding position with other parts. A From the viewpoint of ideal hardening, it is more ideal that both are hydrogen atoms. The number of carbon atoms in the alkyl group is preferably 1 to 3, more preferably 1 to 2, from the viewpoint of ideal hardening.
本說明書中,樹脂固體成分係指排除填充材及溶劑之成分,係含有式(M)表示之化合物(M)、具有式(V)表示之構成單元的聚合物(V)、及式(M1)表示之化合物(M1)、以及因應需要摻合之其它熱硬化性化合物(C)、及其它樹脂添加劑成分(阻燃劑等添加劑等)之概念。In this specification, the resin solid content refers to the component excluding fillers and solvents, and contains the compound (M) represented by the formula (M), the polymer (V) having the structural unit represented by the formula (V), and the formula (M1 ) represents the concept of the compound (M1), as well as other thermosetting compounds (C) and other resin additive components (additives such as flame retardants, etc.) that are blended as necessary.
本實施形態之樹脂組成物其特徵為含有:式(M)表示之化合物(M)、具有式(V)表示之構成單元的聚合物(V)、及式(M1)表示之化合物(M1)。 [化10] 式(M)中,R分別獨立地表示也可被鹵素原子取代之碳數1~10之烴基,R mx分別獨立地為亞甲基、亞乙基、或2,2-亞丙基,R my為選自下述群(A)之基。m表示0~3之整數,n為重複數之平均值,且表示1.00≦n≦20.00。 (群(A)) [化11] 群(A)中,R y分別獨立地為碳數1~4之烷基、碳數1~4之烷氧基、或也可具有取代基之苯基,ny分別獨立地為0~3之整數,*為和R mx之鍵結位置。 [化12] 式(V)中,Ar表示芳香族烴連結基。*表示鍵結位置。 [化13] 式(M1)中,R M1、R M2、R M3及R M4分別獨立地表示氫原子或有機基。R M5及R M6分別獨立地表示氫原子或烷基。Ar M表示2價芳香族基。A為4~6員環之脂環基。R M7及R M8分別獨立地為烷基。mx為1或2,lx為0或1。R M9及R M10分別獨立地表示氫原子或烷基。R M11、R M12、R M13及R M14分別獨立地表示氫原子或有機基。R M15分別獨立地表示碳數1~10之烷基、碳數1~10之烷基氧基、碳數1~10之烷基硫代基、碳數6~10之芳基、碳數6~10之芳氧基、碳數6~10之芳基硫代基、鹵素原子、羥基或巰基。px表示0~3之整數。nx表示1~20之整數。 The resin composition of this embodiment is characterized by containing a compound (M) represented by formula (M), a polymer (V) having a structural unit represented by formula (V), and a compound (M1) represented by formula (M1). . [Chemical 10] In the formula (M), R each independently represents a hydrocarbon group with 1 to 10 carbon atoms that may be substituted by a halogen atom, R mx each independently represents a methylene group, an ethylene group, or a 2,2-propylene group, and R my is a base selected from the following group (A). m represents an integer from 0 to 3, n is the average of repeated numbers, and represents 1.00≦n≦20.00. (Group (A)) [Chemicalization 11] In group (A), R y is each independently an alkyl group having 1 to 4 carbon atoms, an alkoxy group having 1 to 4 carbon atoms, or a phenyl group which may have a substituent, and ny is each independently an alkyl group having 0 to 3 carbon atoms. Integer, * is the bonding position with R mx . [Chemical 12] In formula (V), Ar represents an aromatic hydrocarbon connecting group. *Indicates bonding position. [Chemical 13] In formula (M1), R M1 , R M2 , R M3 and R M4 each independently represent a hydrogen atom or an organic group. R M5 and R M6 each independently represent a hydrogen atom or an alkyl group. Ar M represents a divalent aromatic group. A is an alicyclic group with 4 to 6 members. R M7 and R M8 are each independently an alkyl group. mx is 1 or 2, lx is 0 or 1. R M9 and R M10 each independently represent a hydrogen atom or an alkyl group. RM11 , RM12 , RM13 and RM14 each independently represent a hydrogen atom or an organic group. R M15 independently represents an alkyl group having 1 to 10 carbon atoms, an alkyloxy group having 1 to 10 carbon atoms, an alkylthio group having 1 to 10 carbon atoms, an aryl group having 6 to 10 carbon atoms, or an aryl group having 6 carbon atoms. An aryloxy group with ∼10 carbon atoms, an arylthio group with 6 to 10 carbon atoms, a halogen atom, a hydroxyl group or a mercapto group. px represents an integer from 0 to 3. nx represents an integer from 1 to 20.
藉由設為如此的構成,可獲得維持優良的低介電特性(Dk及/或Df),同時吸濕耐熱性優良的樹脂組成物。 其機制不限於此,據推測式(M)表示之化合物(M)中,R mxy為亞甲基、亞乙基、或2,2-亞丙基,且2個R mx鍵結於1個苯環,藉此成為更緻密的結構,故即使交聯反應進行也不易變得剛直,並變得容易和其它樹脂成分相容。尤其,據推測藉由組和式(M)表示之化合物(M)及具有式(V)表示之構成單元的聚合物(V),會達成低介電特性(低相對介電常數、低介電損耗正切(尤其低介電損耗正切))。又,據推測藉由對於式(M1)表示之化合物(M1)及具有式(V)表示之構成單元的聚合物(V),使硬化反應溫度比這些化合物更高的式(M)表示之化合物(M)予以複合化,會平衡良好地控制硬化反應之進行,結果吸濕耐熱性會改善。 此外,本實施形態之樹脂組成物可製成耐熱性高者。又,本實施形態之樹脂組成物可製成剝離強度高者。此外,本實施形態之樹脂組成物可製成除膠渣耐性優良者。 By adopting such a structure, it is possible to obtain a resin composition that is excellent in moisture absorption and heat resistance while maintaining excellent low dielectric properties (Dk and/or Df). The mechanism is not limited to this. It is speculated that in the compound (M) represented by the formula (M), R mxy is a methylene group, an ethylene group, or a 2,2-propylene group, and two R mx are bonded to one The benzene ring thus becomes a denser structure, so it is less likely to become rigid even if the cross-linking reaction proceeds, and it becomes easier to be compatible with other resin components. In particular, it is presumed that low dielectric properties (low relative dielectric constant, low dielectric constant) will be achieved by combining the compound (M) represented by the formula (M) and the polymer (V) having the structural unit represented by the formula (V). Electrical loss tangent (especially low dielectric loss tangent)). Furthermore, it is presumed that the compound (M1) represented by the formula (M1) and the polymer (V) having the structural unit represented by the formula (V) are represented by the formula (M) by making the hardening reaction temperature higher than that of these compounds. Compounding the compound (M) will control the progress of the hardening reaction in a well-balanced manner, and as a result, the moisture absorption and heat resistance will be improved. In addition, the resin composition of this embodiment can be made to have high heat resistance. Furthermore, the resin composition of this embodiment can be made to have high peel strength. In addition, the resin composition of this embodiment can be made to have excellent smear removal resistance.
<式(M)表示之化合物(M)> 本實施形態之樹脂組成物含有式(M)表示之化合物(M)。藉由含有式(M)表示之化合物(M),可有效地達成得到的樹脂組成物之低介電特性(Dk及/或Df)。 [化14] 式(M)中,R分別獨立地表示也可被鹵素原子取代之碳數1~10之烴基,R mx分別獨立地為亞甲基、亞乙基、或2,2-亞丙基,R my為選自下述群(A)之基。m表示0~3之整數,n為重複數之平均值,且表示1.00≦n≦20.00。 (群(A)) [化15] 群(A)中,R y分別獨立地為碳數1~4之烷基、碳數1~4之烷氧基、或也可具有取代基之苯基,ny分別獨立地為0~3之整數,*為和R mx之鍵結位置。 <Compound (M) represented by formula (M)> The resin composition of this embodiment contains the compound (M) represented by formula (M). By containing the compound (M) represented by the formula (M), the low dielectric properties (Dk and/or Df) of the obtained resin composition can be effectively achieved. [Chemical 14] In the formula (M), R each independently represents a hydrocarbon group with 1 to 10 carbon atoms that may be substituted by a halogen atom, R mx each independently represents a methylene group, an ethylene group, or a 2,2-propylene group, and R my is a base selected from the following group (A). m represents an integer from 0 to 3, n is the average of repeated numbers, and represents 1.00≦n≦20.00. (Group (A)) [Chemical 15] In group (A), R y is each independently an alkyl group having 1 to 4 carbon atoms, an alkoxy group having 1 to 4 carbon atoms, or a phenyl group which may have a substituent, and ny is each independently an alkyl group having 0 to 3 carbon atoms. Integer, * is the bonding position with R mx .
式(M)中,R分別獨立地表示也可被鹵素原子取代之碳數1~10之烴基,宜為也可被鹵素原子取代之碳數1~10之烷基、或也可被鹵素原子取代之苯基,為選自由也可被鹵素原子取代之甲基、乙基、丙基(宜為異丙基)、丁基(宜為二級丁基、三級丁基)、及苯基構成之群組中之至少1種更佳。前述鹵素原子宜為氟原子、氯原子、溴原子或碘原子,為氟原子或氯原子更佳。本實施形態中,R宜為未被鹵素原子取代之碳數1~10之烴基。In the formula (M), R each independently represents a hydrocarbon group having 1 to 10 carbon atoms which may be substituted by a halogen atom, preferably an alkyl group having 1 to 10 carbon atoms which may be substituted by a halogen atom, or a halogen atom. The substituted phenyl group is selected from methyl, ethyl, propyl (preferably isopropyl), butyl (preferably secondary butyl, tertiary butyl), and phenyl which may also be substituted by a halogen atom. At least one of the groups is preferred. The aforementioned halogen atom is preferably a fluorine atom, a chlorine atom, a bromine atom or an iodine atom, more preferably a fluorine atom or a chlorine atom. In this embodiment, R is preferably a hydrocarbon group having 1 to 10 carbon atoms that is not substituted by a halogen atom.
式(M)中,m表示0~3之整數,宜為0~2之整數,為0或1更佳,為0再更佳。In the formula (M), m represents an integer from 0 to 3, preferably an integer from 0 to 2, more preferably 0 or 1, more preferably 0.
式(M)中,R mx分別獨立地為亞甲基、亞乙基、或2,2-亞丙基。據推測R mx藉由使用亞甲基、亞乙基、或2,2-亞丙基,比起芳香環,具有低介電特性(Dk及/或Df)且為柔軟的結構,故即使交聯反應進行也不易變得剛直,變得容易和其它樹脂成分相容。R mx宜分別獨立地為亞乙基、或2,2-亞丙基,為2,2-亞丙基更佳。 In formula (M), R mx are each independently a methylene group, an ethylene group, or a 2,2-propylene group. It is speculated that by using methylene, ethylene, or 2,2-propylene, R mx has lower dielectric properties (Dk and/or Df) and a soft structure than an aromatic ring, so even if it is crossed It is not easy to become rigid even when the coupling reaction is going on, and it is easy to be compatible with other resin components. R mx is preferably each independently an ethylene group or a 2,2-propylene group, and is more preferably a 2,2-propylene group.
式(M)中,R my為選自群(A)之基。如此,藉由為介隔1個苯環而和相鄰的2個R mx鍵結之結構,不會成為必要以上地剛硬的結構,而變得容易和其它樹脂成分相容。 In formula (M), Rmy is a base selected from group (A). In this way, by having a structure that is bonded to two adjacent R mx via one benzene ring, the structure does not become more rigid than necessary and becomes easily compatible with other resin components.
群(A)中,R y分別獨立地為碳數1~4之烷基、碳數1~4之烷氧基、或也可具有取代基之苯基,宜為選自由甲基、乙基、丙基、甲氧基、乙氧基、及苯基構成之群組中之至少1種。 ny分別獨立地為0~3之整數,宜為0~2之整數,為0或1更佳,為0再更佳。 In group (A), R y is each independently an alkyl group having 1 to 4 carbon atoms, an alkoxy group having 1 to 4 carbon atoms, or a phenyl group which may have a substituent, and is preferably selected from methyl and ethyl groups. At least one of the group consisting of , propyl, methoxy, ethoxy, and phenyl. ny is independently an integer from 0 to 3, preferably an integer from 0 to 2, more preferably 0 or 1, even more preferably 0.
在本實施形態,群(A)中, [化16] 較理想。 In this embodiment, in group (A), [Chemical 16] More ideal.
又,式(M)中,n為重複數之平均值,且表示1.00≦n≦20.00。 n宜為1.05以上(1.05≦n),為1.10以上(1.10≦n)更佳,為1.20以上(1.20≦n)再更佳,為1.25以上(1.25≦n)又更佳,為1.30以上(1.30≦n)再更佳,為1.50以上(1.50≦n)又更佳。藉由為前述下限值以上,式(M)表示之化合物(M)之低介電特性(Dk及/或Df)會有改善的傾向,使用其之樹脂組成物乃至得到的硬化物之低介電特性(Dk及/或Df)也會有改善的傾向。尤其,藉由設定1.00≦n,由於式(M)表示之化合物(M)的結晶性會降低,故會有溶劑溶解性改善的傾向。又,n宜為10.00以下(n≦10.00),為5.00以下(n≦5.00)更佳,為3.00以下(n≦3.00)再更佳,為2.75以下(n≦2.75)又更佳,為2.50以下(n≦2.50)再更佳。藉由為前述上限值以下,會有含有式(M)表示之化合物(M)的樹脂組成物之黏度會降低、含浸性會變良好、成形性優良的傾向。 n之值,例如可由利用式(M)表示之化合物(M)的凝膠滲透層析(GPC,檢測器:RI)之測定所求得的數目平均分子量或由分離之峰部的各個面積比來求得。 In addition, in the formula (M), n is the average of the repeated numbers, and represents 1.00≦n≦20.00. n is preferably 1.05 or more (1.05≦n), more preferably 1.10 or more (1.10≦n), more preferably 1.20 or more (1.20≦n), more preferably 1.25 or more (1.25≦n), more preferably 1.30 or more ( 1.30≦n) is even better, and above 1.50 (1.50≦n) is even better. By being above the aforementioned lower limit, the low dielectric properties (Dk and/or Df) of the compound (M) represented by the formula (M) tend to be improved, and the resin composition using the compound (M) and even the obtained cured product tend to have low dielectric properties. The dielectric properties (Dk and/or Df) also tend to improve. In particular, by setting 1.00≦n, the crystallinity of the compound (M) represented by the formula (M) decreases, so the solvent solubility tends to improve. In addition, n is preferably 10.00 or less (n≦10.00), more preferably 5.00 or less (n≦5.00), more preferably 3.00 or less (n≦3.00), and 2.75 or less (n≦2.75), still more preferably 2.50 The following (n≦2.50) is even better. By being below the aforementioned upper limit, the viscosity of the resin composition containing the compound (M) represented by the formula (M) will be reduced, the impregnation property will be improved, and the moldability will tend to be excellent. The value of n can be, for example, the number average molecular weight obtained by measuring the compound (M) represented by the formula (M) by gel permeation chromatography (GPC, detector: RI) or the area ratio of each separated peak. Come and ask for it.
本實施形態中,式(M)表示之化合物(M)宜包含式(M-1)表示之化合物。 [化17] 式(M-1)中,R分別獨立地表示也可被鹵素原子取代之碳數1~10之烴基。m表示0~3之整數,n為重複數之平均值,且表示1.00≦n≦20.00。 In this embodiment, the compound (M) represented by the formula (M) preferably includes the compound represented by the formula (M-1). [Chemical 17] In the formula (M-1), R each independently represents a hydrocarbon group having 1 to 10 carbon atoms which may be substituted by a halogen atom. m represents an integer from 0 to 3, n is the average of repeated numbers, and represents 1.00≦n≦20.00.
式(M-1)中,R、m及n分別和式(M)中的R、m及n同義,理想範圍亦同樣。In formula (M-1), R, m and n are synonymous with R, m and n in formula (M) respectively, and the ideal range is also the same.
本實施形態中,式(M)表示之化合物(M)包含式(M-2)表示之化合物更佳。 [化18] 式(M-2)中,R z分別獨立地表示碳數1~10之烴基。m表示0~3之整數,n為重複數之平均值,且表示1.00≦n≦20.00。 In this embodiment, it is more preferable that the compound (M) represented by the formula (M) contains the compound represented by the formula (M-2). [Chemical 18] In formula (M-2), Rz each independently represents a hydrocarbon group having 1 to 10 carbon atoms. m represents an integer from 0 to 3, n is the average of repeated numbers, and represents 1.00≦n≦20.00.
式(M-2)中,m及n分別和式(M)中的m及n同義,理想範圍亦同樣。 R z為碳數1~10之烴基,宜為碳數1~10之烷基或苯基,為選自由也可被鹵素原子取代之甲基、乙基、丙基(宜為異丙基)、丁基(宜為二級丁基、三級丁基)、及苯基構成之群組中之至少1種更佳。 In the formula (M-2), m and n are synonymous with m and n in the formula (M), respectively, and the ideal range is also the same. R z is a hydrocarbon group with 1 to 10 carbon atoms, preferably an alkyl group or phenyl group with 1 to 10 carbon atoms, and is selected from methyl, ethyl, and propyl groups (preferably isopropyl) which may also be substituted by a halogen atom. , butyl (preferably secondary butyl, tertiary butyl), and at least one of the group consisting of phenyl is more preferred.
本實施形態中,式(M)表示之化合物(M)(宜在式(M)表示之化合物(M)所含的n=1體中)宜包含2個末端的馬來醯亞胺基和距前述馬來醯亞胺基最近的R mx(宜為2,2-亞丙基)皆位於相對苯環為對位之化合物(M-A)、2個末端的馬來醯亞胺基中之一者和距前述馬來醯亞胺基最近的R mx(宜為2,2-亞丙基)位於相對苯環為間位或鄰位,另一者之馬來醯亞胺基和距前述馬來醯亞胺基最近的R mx(宜為2,2-亞丙基)位於相對苯環為對位之化合物(M-B)、及2個末端的馬來醯亞胺基和距前述馬來醯亞胺基最近的R mx(宜為2,2-亞丙基)皆位於相對苯環為間位或鄰位之化合物(M-C)。如此,藉由設為化合物(M-A)和分子內的伸苯基馬來醯亞胺基部分之旋轉自由度高的化合物(M-B)及化合物(M-C)進行混合之構成,會有硬化反應時的樹脂組成物中之交聯反應點的分佈自由度會變高,並形成具有更牢固的網絡之樹脂硬化物的傾向。結果,得到的硬化物之耐熱性(例如玻璃轉移溫度)、低熱膨脹性會有更為改善的傾向。 上述化合物(M-B)及化合物(M-C)中,宜為末端馬來醯亞胺基和R mx(宜為2,2-亞丙基)位於相對苯環為鄰位之化合物。 In this embodiment, the compound (M) represented by the formula (M) (preferably in the n=1 form contained in the compound (M) represented by the formula (M)) preferably contains two terminal maleimide groups and The nearest R mx to the aforementioned maleimide group (preferably 2,2-propylene) is located in one of the two terminal maleimide groups of the compound (MA) in the para position relative to the benzene ring. The one and the R mx (preferably 2,2-propylene) closest to the aforementioned maleimide group are located in the meta or ortho position relative to the benzene ring, and the other maleimide group is in the meta or ortho position with respect to the aforementioned maleimide group. The nearest R mx of the maleimide group (preferably 2,2-propylene) is located in a compound (MB) in the para position relative to the benzene ring, and the two terminal maleimide groups are far away from the aforementioned maleyl group. The nearest R mx of the imine group (preferably 2,2-propylene) is located in a compound (MC) in the meta or ortho position relative to the benzene ring. In this way, by mixing the compound (MA) with the compound (MB) and the compound (MC) with a high degree of rotational freedom of the phenylenemaleimide moiety in the molecule, there is a possibility of a hardening reaction. The degree of freedom in the distribution of cross-linking reaction points in the resin composition becomes higher, and a cured resin product with a stronger network tends to be formed. As a result, the heat resistance (such as glass transition temperature) and low thermal expansion of the resulting cured product tend to be further improved. Among the above compounds (MB) and compound (MC), it is preferable that the terminal maleimide group and R mx (preferably 2,2-propylene group) are located in the ortho position relative to the benzene ring.
本實施形態中,在HPLC分析時,式(M)表示之化合物(M)中之化合物(M-A)的比例宜為90面積%以下,為80面積%以下更佳,為70面積%以下再更佳,也可為50面積%以下、30面積%以下。藉由設為前述上限值以下,由於結晶性會降低,故會有溶劑溶解性改善的傾向。又,化合物(M-A)的比例也可為0面積%,為2面積%以上更佳,為5面積%以上再更佳,亦可為10面積%以上。藉由將化合物(M-A)的比例設定為2面積%以上,會有可有效地抑制反應性降低的傾向。 上述化合物(M-A)的比例,在式(M)中為1.00≦n≦5.00時,宜符合上述範圍,為1.00≦n≦3.00時,符合上述範圍更佳,為n=1時,符合上述範圍再更佳。又,化合物(M-A)含有下述化合物作為主成分(例如以式(M)表示之化合物(M)之2面積%以上的比例)時,宜符合上述範圍。 [化19] 本實施形態中,在HPLC分析時,式(M)表示之化合物(M)中之化合物(M-B)的比例宜未達60面積%,未達55面積%更佳。藉由設為前述上限值以下,會有可達成式(M)表示之化合物(M)之製造成本、產業廢棄物之減少的傾向。又,化合物(M-B)的比例宜為30面積%以上,為35面積%以上更佳,為40面積%以上再更佳。具有非對稱結構之化合物(M-B)的比例藉由為30面積%以上,會有除了改善溶劑溶解性之外,還會改善得到的硬化物之低介電特性(Dk及/或Df)的傾向。 上述,化合物(M-B)的比例,在式(M)中為1.00≦n≦5.00時,宜符合上述範圍,在1.00≦n≦3.00時,符合上述範圍更佳。又,化合物(M-B)含有下述化合物作為主成分(例如以式(M)表示之化合物(M)之30質量%以上的比例)時,宜符合上述範圍。 [化20] In this embodiment, during HPLC analysis, the proportion of the compound (MA) in the compound (M) represented by the formula (M) is preferably 90 area % or less, more preferably 80 area % or less, and further preferably 70 area % or less. Better, it can also be less than 50 area% or less than 30 area%. By setting it below the upper limit, the crystallinity is reduced, so the solvent solubility tends to be improved. Moreover, the proportion of the compound (MA) may be 0 area %, more preferably 2 area % or more, still more preferably 5 area % or more, or 10 area % or more. By setting the ratio of the compound (MA) to 2 area % or more, there is a tendency that the decrease in reactivity can be effectively suppressed. When the proportion of the above compound (MA) in the formula (M) is 1.00≦n≦5.00, it should conform to the above range. When it is 1.00≦n≦3.00, it is better to conform to the above range. When n=1, it conforms to the above range. Even better. In addition, when the compound (MA) contains the following compound as a main component (for example, the proportion of the compound (M) represented by the formula (M) is 2 area % or more), it is preferably within the above range. [Chemical 19] In this embodiment, during HPLC analysis, the proportion of the compound (MB) in the compound (M) represented by the formula (M) is preferably less than 60 area %, and more preferably less than 55 area %. By setting it below the upper limit, the production cost of the compound (M) represented by the formula (M) and the reduction of industrial waste tend to be achieved. Moreover, the ratio of the compound (MB) is preferably 30 area % or more, more preferably 35 area % or more, and still more preferably 40 area % or more. When the proportion of the compound (MB) having an asymmetric structure is 30 area % or more, in addition to improving the solvent solubility, the low dielectric properties (Dk and/or Df) of the obtained hardened material tend to be improved. . As mentioned above, when the ratio of compound (MB) in formula (M) is 1.00≦n≦5.00, it should be within the above range, and when 1.00≦n≦3.00, it is more preferably within the above range. In addition, when the compound (MB) contains the following compound as a main component (for example, the proportion of the compound (M) represented by the formula (M) is 30% by mass or more), it is preferably within the above range. [Chemistry 20]
本實施形態中,在HPLC分析時,式(M)表示之化合物(M)中之化合物(M-C)的比例宜為未達60面積%,未達50面積%更佳。又,化合物(M-C)的比例宜為15面積%以上,為25面積%以上更佳。化合物(M-C)的比例藉由為15面積%以上,低介電特性(Dk及/或Df)更優良,藉由未達60面積%,硬化性、密合性良好,且可有效地抑制基板等之製作時的瑕疵。 上述,化合物(M-C)的比例,在式(M)中為1.00≦n≦5.00時,宜符合上述範圍,在1.00≦n≦3.00時,符合上述範圍更佳。又,化合物(M-C)含有下述化合物作為主成分(例如以式(M)表示之化合物之15質量%以上的比例)時,宜符合上述範圍。 [化21] In this embodiment, during HPLC analysis, the proportion of the compound (MC) in the compound (M) represented by the formula (M) is preferably less than 60 area %, and more preferably less than 50 area %. Moreover, the ratio of the compound (MC) is preferably 15 area % or more, more preferably 25 area % or more. When the proportion of the compound (MC) is 15 area % or more, the low dielectric properties (Dk and/or Df) are better. When it is less than 60 area %, the hardening and adhesion are good, and the substrate can be effectively suppressed. Wait for defects in production. As mentioned above, when the ratio of the compound (MC) in the formula (M) is 1.00≦n≦5.00, it should be within the above range, and when 1.00≦n≦3.00, it is more preferably within the above range. In addition, when the compound (MC) contains the following compound as a main component (for example, the proportion of the compound represented by the formula (M) is 15% by mass or more), it is preferably within the above range. [Chemistry 21]
又,由於在結晶性的問題及電特性惡化的問題中,化合物(M-A)的影響大,故式(M)表示之化合物(M)中之化合物(M-B)與化合物(M-C)的合計比率,相對於化合物(M-A)、化合物(M-B)、及化合物(M-C)之合計量,宜為50面積%以上,為60面積%以上再更佳,為70面積%以上特佳。上限例如為100面積%以下,此外,也可為99面積%以下。 尤其,在式(M)中,為1.00≦n≦5.00時,宜符合上述範圍,在1.00≦n≦3.00時,符合上述範圍更佳。 In addition, since the compound (M-A) has a large influence on the problem of crystallinity and deterioration of electrical characteristics, the total ratio of the compound (M-B) and the compound (M-C) in the compound (M) represented by the formula (M), The total amount of compound (M-A), compound (M-B), and compound (M-C) is preferably 50 area % or more, more preferably 60 area % or more, particularly preferably 70 area % or more. The upper limit is, for example, 100 area % or less, and may be 99 area % or less. In particular, in formula (M), when 1.00≦n≦5.00, it is preferably within the above range, and when 1.00≦n≦3.00, it is more preferably within the above range.
式(M)表示之化合物(M)之依據JIS K-7234之方法測得的軟化點,宜為50℃以上,為80℃以上更佳,為90℃以上再更佳,為95℃以上特佳。軟化點宜為150℃以下,為140℃以下更佳,為130℃以下再更佳,為120℃以下又更佳,也可為110℃以下、100℃以下。The softening point of the compound (M) represented by the formula (M) measured according to the method of JIS K-7234 is preferably 50°C or higher, more preferably 80°C or higher, more preferably 90°C or higher, particularly 95°C or higher. good. The softening point is preferably 150°C or lower, more preferably 140°C or lower, more preferably 130°C or lower, still more preferably 120°C or lower, and may also be 110°C or lower, or 100°C or lower.
式(M)表示之化合物(M)之酸價宜為30mgKOH/g以下,為1~15mgKOH/g再更佳。酸價高的話,未被馬來醯亞胺化之分子多,具有羧酸之結構會變得過量,故會對電特性、耐水性造成影響。The acid value of the compound (M) represented by the formula (M) is preferably 30 mgKOH/g or less, more preferably 1 to 15 mgKOH/g. If the acid value is high, there will be many molecules that have not been imidized by maleyl, and there will be an excess of carboxylic acid structures, which will affect the electrical properties and water resistance.
式(M)表示之化合物(M)的重量平均分子量(Mw)宜為500以上,此外,也可為600以上、700以上。藉由設為前述下限值以上,會有得到的硬化物之低介電特性(Dk及/或Df)及低吸水性更為改善的傾向。式(M)表示之化合物(M)的重量平均分子量(Mw)之上限宜為10000以下,為9000以下更佳,為7000以下再更佳,為5000以下又更佳,為3000以下再更佳,為1000以下又更佳。藉由設為前述上限值以下,會有得到的硬化物之耐熱性及操作性更為改善的傾向。The weight average molecular weight (Mw) of the compound (M) represented by the formula (M) is preferably 500 or more, and may be 600 or more or 700 or more. By setting it to above the lower limit, the low dielectric properties (Dk and/or Df) and low water absorption of the obtained cured product tend to be further improved. The upper limit of the weight average molecular weight (Mw) of the compound (M) represented by the formula (M) is preferably 10,000 or less, more preferably 9,000 or less, still more preferably 7,000 or less, more preferably 5,000 or less, still more preferably 3,000 or less , preferably below 1,000. By setting it below the aforementioned upper limit, the heat resistance and workability of the obtained cured product tend to be further improved.
式(M)表示之化合物(M)之合成方法可參酌國際公開第2020-054601號之記載及國際公開第2021-182360號之記載,並將這些內容納入本說明書中。以這些公報所記載之方法合成式(M)表示之化合物(M)的話,能以化合物(M-A)與化合物(M-B)與化合物(M-C)之混合物的形式獲得式(M)表示之化合物(M)。 又,式(M)表示之化合物(M)也可使用市售品,可列舉例如:日本化藥公司製MIR-5000(式(M-2)中,m=0之化合物)。MIR-5000也可利用上述公報所記載之方法來合成。 For the synthesis method of compound (M) represented by formula (M), please refer to the records of International Publication No. 2020-054601 and International Publication No. 2021-182360, and these contents are incorporated into this specification. When the compound (M) represented by the formula (M) is synthesized by the method described in these publications, the compound (M) represented by the formula (M) can be obtained as a mixture of the compound (M-A), the compound (M-B) and the compound (M-C). ). In addition, a commercially available product may be used as the compound (M) represented by the formula (M). For example, MIR-5000 (a compound in the formula (M-2) in which m=0) manufactured by Nippon Kayaku Co., Ltd. can be used. MIR-5000 can also be synthesized by the method described in the above-mentioned publication.
本實施形態之樹脂組成物中,令樹脂組成物中之樹脂固體成分為100質量份時,式(M)表示之化合物(M)的含量宜為5~50質量份。式(M)表示之化合物(M)的含量之下限值,相對於樹脂組成物中之樹脂固體成分100質量份,宜為5質量份以上,為7質量份以上更佳,為10質量份以上再更佳,為15質量份以上又更佳,為18質量份以上再更佳。式(M)表示之化合物(M)的含量藉由為5質量份以上,會有得到的硬化物之低介電特性(Dk及/或Df,尤其低介電損耗正切性)、金屬箔剝離強度改善的傾向。又,式(M)表示之化合物(M)的含量之上限值相對於樹脂組成物中之樹脂固體成分100質量份,宜為50質量份以下,為45質量份以下更佳,為40質量份以下再更佳,為35質量份以下又更佳,也可為30質量份以下,亦可為25質量份以下。式(M)表示之化合物(M)的含量藉由為50質量份以下,會有得到的硬化物之耐熱性及吸濕耐熱性更為改善的傾向。 本實施形態中的樹脂組成物中,可僅含1種式(M)表示之化合物(M),也可含有2種以上。含有2種以上時,合計量宜為上述範圍。 In the resin composition of this embodiment, when the resin solid content in the resin composition is 100 parts by mass, the content of the compound (M) represented by the formula (M) is preferably 5 to 50 parts by mass. The lower limit of the content of the compound (M) represented by the formula (M) is preferably 5 parts by mass or more, more preferably 7 parts by mass or more, and 10 parts by mass relative to 100 parts by mass of the resin solid content in the resin composition. More preferably, it is more than 15 parts by mass, still more preferably 18 parts by mass or more. When the content of the compound (M) represented by the formula (M) is 5 parts by mass or more, the obtained hardened material will have low dielectric properties (Dk and/or Df, especially low dielectric loss tangent) and metal foil peeling. Tendency to improve strength. Moreover, the upper limit of the content of the compound (M) represented by the formula (M) is preferably 50 parts by mass or less, more preferably 45 parts by mass or less, based on 100 parts by mass of the resin solid content in the resin composition. It is more preferably not more than 30 parts by mass, more preferably not more than 35 parts by mass. It may be 30 parts by mass or less, or it may be 25 parts by mass or less. When the content of the compound (M) represented by the formula (M) is 50 parts by mass or less, the heat resistance and moisture absorption heat resistance of the obtained cured product tend to be further improved. The resin composition in this embodiment may contain only one type of compound (M) represented by formula (M), or may contain two or more types. When two or more types are contained, the total amount is preferably within the above range.
<具有式(V)表示之構成單元的聚合物(V)> 本實施形態之樹脂組成物含有具有式(V)表示之構成單元的聚合物(V)。藉由含有具有式(V)表示之構成單元的聚合物(V),可獲得低介電特性(低介電常數、低介電損耗正切)優良的樹脂組成物。尤其,藉由和式(M)表示之化合物(M)進行組合使用,會形成具有牢固的網絡之樹脂硬化物,故據推測其低介電特性(Dk及/或Df)優良,同時低熱膨脹係數(低CTE)亦優良。 [化22] 式(V)中,Ar表示芳香族烴連結基。*表示鍵結位置。 <Polymer (V) having a structural unit represented by formula (V)> The resin composition of this embodiment contains a polymer (V) having a structural unit represented by formula (V). By containing the polymer (V) having the structural unit represented by the formula (V), a resin composition excellent in low dielectric properties (low dielectric constant, low dielectric loss tangent) can be obtained. In particular, when used in combination with the compound (M) represented by the formula (M), a cured resin with a strong network is formed, so it is presumed to have excellent low dielectric properties (Dk and/or Df) and low thermal expansion. The coefficient (low CTE) is also excellent. [Chemistry 22] In formula (V), Ar represents an aromatic hydrocarbon connecting group. *Indicates bonding position.
芳香族烴連結基可為僅由也可具有取代基之芳香族烴構成的基,亦可為由也可具有取代基之芳香族烴和其它連結基之組合構成的基。芳香族烴連結基宜為僅由也可具有取代基之芳香族烴構成的基。另外,芳香族烴也可具有的取代基,可列舉取代基Z(例如碳數1~6之烷基、碳數2~6之烯基、碳數2~6之炔基、碳數1~6之烷氧基、羥基、胺基、羧基、鹵素原子等)。又,上述芳香族烴宜為不具取代基者。 芳香族烴連結基通常為2價連結基。 The aromatic hydrocarbon connecting group may be a group consisting only of an aromatic hydrocarbon which may have a substituent, or a group consisting of a combination of an aromatic hydrocarbon which may have a substituent and other connecting groups. The aromatic hydrocarbon linking group is preferably a group consisting only of aromatic hydrocarbons which may have a substituent. In addition, the substituent that the aromatic hydrocarbon may have includes substituent Z (for example, an alkyl group with 1 to 6 carbon atoms, an alkenyl group with 2 to 6 carbon atoms, an alkynyl group with 2 to 6 carbon atoms, an alkyl group with 1 to 6 carbon atoms, etc.). 6 alkoxy group, hydroxyl group, amine group, carboxyl group, halogen atom, etc.). Moreover, it is preferable that the above-mentioned aromatic hydrocarbon has no substituent. The aromatic hydrocarbon linking group is usually a divalent linking group.
芳香族烴連結基具體可列舉也可具有取代基之伸苯基、萘二基、蒽二基、菲二基、聯苯二基、茀二基,其中,宜為也可具有取代基之伸苯基。取代基係例示上述取代基Z,但上述伸苯基等基團宜不具有取代基。Specific examples of the aromatic hydrocarbon linking group include phenylene group, naphthalenediyl group, anthracenediyl group, phenanthrenediyl group, biphenyldiyl group, and quinediyl group which may have a substituent. Among them, an optionally substituted phenylene group is preferred. phenyl. The substituent is exemplified by the above-mentioned substituent Z. However, the above-mentioned groups such as phenylene group are preferably unsubstituted.
式(V)表示之構成單元包含下式(V1)表示之構成單元、下式(V2)表示之構成單元、及下式(V3)表示之構成單元中之至少1種更佳。另外,下式中之*表示鍵結位置。又,以下,有時會將式(V1)~(V3)表示之構成單元統稱為「構成單元(a)」。It is more preferable that the structural unit represented by formula (V) contains at least one kind of the structural unit represented by the following formula (V1), the structural unit represented by the following formula (V2), and the structural unit represented by the following formula (V3). In addition, * in the following formula represents a bonding position. In addition, below, the structural units represented by Formulas (V1) to (V3) may be collectively referred to as "structural units (a)".
[化23] 式(V1)~(V3)中,L 1為芳香族烴連結基(宜為碳數6~22,為6~18更佳,為6~10再更佳)。具體可列舉也可具有取代基之伸苯基、萘二基、蒽二基、菲二基、聯苯二基、茀二基,其中,宜為也可具有取代基之伸苯基。取代基係例示上述取代基Z,但上述伸苯基等基團宜不具有取代基。 形成構成單元(a)之化合物宜為二乙烯基芳香族化合物,可列舉例如:二乙烯苯、雙(1-甲基乙烯基)苯、二乙烯萘、二乙烯蒽、二乙烯聯苯、二乙烯菲等。其中,二乙烯苯特佳。這些二乙烯基芳香族化合物可使用1種,也可因應需要使用2種以上。 [Chemistry 23] In the formulas (V1) to (V3), L 1 is an aromatic hydrocarbon linking group (preferably it has 6 to 22 carbon atoms, more preferably 6 to 18 carbon atoms, more preferably 6 to 10 carbon atoms). Specific examples thereof include phenylene group, naphthalenediyl, anthracenediyl, phenanthrenediyl, biphenyldiyl, and fendiyl which may have a substituent. Among these, a phenylene group which may have a substituent is preferred. The substituent is exemplified by the above-mentioned substituent Z. However, the above-mentioned groups such as phenylene group are preferably unsubstituted. The compound forming the structural unit (a) is preferably a divinyl aromatic compound, and examples thereof include: divinylbenzene, bis(1-methylvinyl)benzene, divinylnaphthalene, divinylanthracene, divinylbiphenyl, divinylbiphenyl, Vinphenanthrene etc. Among them, divinylbenzene is particularly preferred. One type of these divinyl aromatic compounds may be used, or two or more types may be used as needed.
具有式(V)表示之構成單元的聚合物(V)如上所述,可為構成單元(a)之均聚物,亦可為和來自其它單體之構成單元的共聚物。 具有式(V)表示之構成單元的聚合物(V),在共聚物時,就其共聚合比而言,構成單元(a)宜為3莫耳%以上,為5莫耳%以上更佳,為10莫耳%以上再更佳,亦可為15莫耳%以上。上限值宜為90莫耳%以下,為85莫耳%以下更佳,為80莫耳%以下再更佳,為70莫耳%以下又更佳,為60莫耳%以下再更佳,為50莫耳%以下又更佳,為40莫耳%以下再更佳,為30莫耳%以下特佳,此外,也可為25莫耳%以下、20莫耳%以下。 The polymer (V) having the structural unit represented by the formula (V) may be a homopolymer of the structural unit (a) as described above, or a copolymer with a structural unit derived from another monomer. When the polymer (V) having the structural unit represented by the formula (V) is a copolymer, the copolymerization ratio of the structural unit (a) is preferably 3 mol% or more, more preferably 5 mol% or more. , more preferably 10 mol% or more, and may also be 15 mol% or more. The upper limit value is preferably 90 mol% or less, more preferably 85 mol% or less, more preferably 80 mol% or less, still more preferably 70 mol% or less, and even more preferably 60 mol% or less. It is more preferably 50 mol% or less, more preferably 40 mol% or less, particularly preferably 30 mol% or less. In addition, it may be 25 mol% or less or 20 mol% or less.
就來自其它單體的構成單元而言,例示來自具有1個乙烯基之芳香族化合物(單乙烯基芳香族化合物)的構成單元(b)。As for the structural unit derived from another monomer, a structural unit (b) derived from an aromatic compound having one vinyl group (monovinyl aromatic compound) is exemplified.
來自單乙烯基芳香族化合物的構成單元(b),宜為下式(V4)表示之構成單元。The structural unit (b) derived from the monovinyl aromatic compound is preferably a structural unit represented by the following formula (V4).
[化24] 式(V4)中,L 2為芳香族烴連結基,就理想之具體例而言,可列舉上述L 1之例。 R V1為氫原子或碳數1~12之烴基(宜為烷基)。R V1為烴基時,其碳數宜為1~6,為1~3更佳。R V1及L 2也可具有上述取代基Z。 [Chemistry 24] In the formula (V4), L 2 is an aromatic hydrocarbon linking group. Preferable specific examples include the above-mentioned L 1 . R V1 is a hydrogen atom or a hydrocarbon group with 1 to 12 carbon atoms (preferably an alkyl group). When R V1 is a hydrocarbon group, its carbon number is preferably 1 to 6, more preferably 1 to 3. R V1 and L 2 may have the substituent Z mentioned above.
具有式(V)表示之構成單元的聚合物(V)為含有來自單乙烯基芳香族化合物的構成單元(b)之共聚物時,就單乙烯基芳香族化合物之例而言,可列舉:苯乙烯、乙烯萘、乙烯聯苯等乙烯基芳香族化合物;鄰甲基苯乙烯、間甲基苯乙烯、對甲基苯乙烯、鄰,對二甲基苯乙烯、鄰乙基乙烯苯、間乙基乙烯苯、對乙基乙烯苯、甲基乙烯聯苯、乙基乙烯聯苯等核烷基取代乙烯基芳香族化合物等。在此例示的單乙烯基芳香族化合物也可適當地具有上述取代基Z。又,這些單乙烯基芳香族化合物可使用1種也可使用2種以上。When the polymer (V) having a structural unit represented by formula (V) is a copolymer containing a structural unit (b) derived from a monovinyl aromatic compound, examples of the monovinyl aromatic compound include: Styrene, vinyl naphthalene, vinyl biphenyl and other vinyl aromatic compounds; o-methylstyrene, m-methylstyrene, p-methylstyrene, o-, p-dimethylstyrene, o-ethylvinylbenzene, m- Nuclear alkyl-substituted vinyl aromatic compounds such as ethylvinylbenzene, p-ethylvinylbenzene, methylvinylbiphenyl, ethylvinylbiphenyl, etc. The monovinyl aromatic compound exemplified here may also have the above-mentioned substituent Z as appropriate. Moreover, these monovinyl aromatic compounds may be used 1 type or 2 or more types may be used.
具有式(V)表示之構成單元的聚合物(V)為含有構成單元(b)之共聚物時,構成單元(b)的共聚合比宜為10莫耳%以上,為15莫耳%以上再更佳,此外,也可為20莫耳%以上、30莫耳%以上、40莫耳%以上、50莫耳%以上、60莫耳%以上、70莫耳%以上、75莫耳%以上。上限值宜為98莫耳%以下,為90莫耳%以下更佳,為85莫耳%以下再更佳。When the polymer (V) having the structural unit represented by the formula (V) is a copolymer containing the structural unit (b), the copolymerization ratio of the structural unit (b) is preferably 10 mol% or more and 15 mol% or more. More preferably, it may also be 20 mol% or more, 30 mol% or more, 40 mol% or more, 50 mol% or more, 60 mol% or more, 70 mol% or more, or 75 mol% or more. . The upper limit is preferably 98 mol% or less, more preferably 90 mol% or less, and still more preferably 85 mol% or less.
具有式(V)表示之構成單元的聚合物(V)也可具有構成單元(a)及構成單元(b)以外之其它構成單元。其它構成單元可列舉例如來自環烯烴化合物的構成單元(c)等。環烯烴化合物可列舉環結構內具有雙鍵之烴類。具體可列舉:環丁烯、環戊烯、環己烯、環辛烯等單環之環狀烯烴,除此之外,還可列舉:降莰烯、雙環戊二烯等具有降莰烯環結構之化合物;茚、苊等由芳香族環縮合而成的環烯烴化合物等。降莰烯化合物之例可列舉日本特開2018-39995號公報之段落0037~0043所記載者,並將該內容納入本說明書。另外,在此例示的環烯烴化合物也可更具有上述取代基Z。The polymer (V) having the structural unit represented by the formula (V) may have other structural units other than the structural unit (a) and the structural unit (b). Examples of other structural units include structural units (c) derived from cycloolefin compounds. Examples of cycloolefin compounds include hydrocarbons having a double bond in the ring structure. Specific examples include monocyclic cyclic olefins such as cyclobutene, cyclopentene, cyclohexene, and cyclooctene. In addition, examples include norbornene, dicyclopentadiene, and the like having a norbornene ring. Compounds of structure; cyclic olefin compounds formed by the condensation of aromatic rings such as indene and acenaphthene. Examples of norbornene compounds include those described in paragraphs 0037 to 0043 of Japanese Patent Application Laid-Open No. 2018-39995, and the content is incorporated into this specification. In addition, the cycloolefin compound illustrated here may further have the above-mentioned substituent Z.
具有式(V)表示之構成單元的聚合物(V)為含有構成單元(c)之共聚物時,構成單元(c)的共聚合比宜為10莫耳%以上,為20莫耳%以上更佳,為30莫耳%以上再更佳。上限值宜為90莫耳%以下,為80莫耳%以下更佳,為70莫耳%以下再更佳,也可為50莫耳%以下,亦可為30莫耳%以下。When the polymer (V) having the structural unit represented by the formula (V) is a copolymer containing the structural unit (c), the copolymerization ratio of the structural unit (c) is preferably 10 mol% or more and 20 mol% or more. More preferably, it is 30 mol% or more, still more preferably. The upper limit is preferably 90 mol% or less, more preferably 80 mol% or less, still more preferably 70 mol% or less, 50 mol% or less, or 30 mol% or less.
具有式(V)表示之構成單元的聚合物(V)中,也可更納入來自不同的聚合性化合物(以下也稱其它聚合性化合物)的構成單元(d)。其它聚合性化合物(單體)可列舉例如含有3個乙烯基之化合物。具體可列舉:1,3,5-三乙烯基苯、1,3,5-三乙烯基萘、1,2,4-三乙烯基環己烷。或可列舉:乙二醇二丙烯酸酯、丁二烯等。來自其它聚合性化合物的構成單元(d)之共聚合比宜為30莫耳%以下,為20莫耳%以下更佳,為10莫耳%以下再更佳。The polymer (V) having the structural unit represented by the formula (V) may further contain a structural unit (d) derived from a different polymerizable compound (hereinafter also referred to as other polymerizable compound). Examples of other polymerizable compounds (monomers) include compounds containing three vinyl groups. Specific examples include: 1,3,5-trivinylbenzene, 1,3,5-trivinylnaphthalene, and 1,2,4-trivinylcyclohexane. Or examples include: ethylene glycol diacrylate, butadiene, etc. The copolymerization ratio of the structural unit (d) derived from other polymerizable compounds is preferably 30 mol% or less, more preferably 20 mol% or less, and still more preferably 10 mol% or less.
就具有式(V)表示之構成單元的聚合物(V)之一實施形態而言,例示以構成單元(a)為必要成分,且含有構成單元(b)~(d)中之至少1種的聚合物。此外,例示構成單元(a)~(d)之合計佔全部構成單元之95莫耳%以上之態樣,此外例示佔98莫耳%以上之態樣。 就具有式(V)表示之構成單元的聚合物(V)之另一實施形態而言,宜為以構成單元(a)為必要成分,且末端除外之全部構成單元中之含有芳香族環的構成單元為90莫耳%以上者,為95莫耳%以上者更佳,也可為100莫耳%者。 另外,在計算每單位之全部構成單元的莫耳%時,1個構成單元係定義為來自1分子之具有式(V)表示之構成單元的聚合物(V)之製造時所使用的單體(例如二乙烯基芳香族化合物、單乙烯基芳香族化合物等)者。 An embodiment of the polymer (V) having the structural unit represented by the formula (V) includes the structural unit (a) as an essential component and contains at least one of the structural units (b) to (d). of polymers. In addition, an aspect in which the total of the structural units (a) to (d) accounts for more than 95 mol% of all the structural units is exemplified, and an aspect in which the total of the structural units (a) to (d) accounts for more than 98 mol% is exemplified. In another embodiment of the polymer (V) having the structural unit represented by the formula (V), it is preferable that the structural unit (a) is an essential component, and all the structural units except the terminal ones contain an aromatic ring. The structural unit is 90 mol% or more, preferably 95 mol% or more, and may also be 100 mol%. In addition, when calculating mol% of all structural units per unit, one structural unit is defined as the monomer used in the production of the polymer (V) derived from one molecule having the structural unit represented by the formula (V). (For example, divinyl aromatic compounds, monovinyl aromatic compounds, etc.).
具有式(V)表示之構成單元的聚合物(V)之製造方法並無無特別限制,依據常用方法即可,可列舉例如將包含二乙烯基芳香族化合物之原料(依必要可使單乙烯基芳香族化合物、環烯烴化合物等共存),在路易士酸觸媒的存在下進行聚合。路易士酸觸媒可使用三氟化硼等金屬氟化物或其錯合物。The method for producing the polymer (V) having the structural unit represented by the formula (V) is not particularly limited and may be based on a common method. For example, a raw material containing a divinyl aromatic compound (monoethylene may be used if necessary). Aromatic compounds, cycloolefin compounds, etc. coexist), and polymerization is performed in the presence of Lewis acid catalyst. As a Lewis acid catalyst, metal fluorides such as boron trifluoride or complexes thereof can be used.
具有式(V)表示之構成單元的聚合物(V)之鏈末端的結構並無特別限制,若針對來自上述二乙烯基芳香族化合物之基進行說明的話,可列舉採用如下之式(E1)的結構。另外,式(E1)中之L 1和上述式(V1)所界定者相同。*表示鍵結位置。 *-CH=CH-L 1-CH=CH 2(E1) The structure of the chain end of the polymer (V) having the structural unit represented by the formula (V) is not particularly limited. If the group derived from the above-mentioned divinyl aromatic compound is explained, the following formula (E1) can be cited structure. In addition, L 1 in the formula (E1) is the same as that defined in the above formula (V1). *Indicates bonding position. *-CH=CH-L 1 -CH=CH 2 (E1)
來自單乙烯基芳香族化合物之基成為鏈末端時,可列舉採用下式(E2)的結構。式中之L 2及R V1分別和前述式(V4)所定義者同義。*表示鍵結位置。 *-CH=CH-L 2-R V1(E2) When a group derived from a monovinyl aromatic compound serves as a chain terminal, a structure adopting the following formula (E2) can be cited. L 2 and R V1 in the formula are respectively synonymous with those defined in the aforementioned formula (V4). *Indicates bonding position. *-CH=CH-L 2 -R V1 (E2)
具有式(V)表示之構成單元的聚合物(V)之分子量,以數目平均分子量Mn計,宜為300以上,為500以上更佳,為1,000以上再更佳,為1,500以上又更佳。上限宜為130,000以下,為120,000以下更佳,為110,000以下再更佳,為100,000以下又更佳。 具有式(V)表示之構成單元的聚合物(V)之分子量,以重量平均分子量Mw計,宜為3,000以上,為5,000以上更佳,為10,000以上再更佳。藉由設為前述下限值以上,可在樹脂組成物之硬化物中,使具有式(V)表示之構成單元的聚合物(V)所具有之優良的低介電特性(Dk及/或Df),尤其Df、吸濕後之介電特性有效地發揮。上限宜為130,000以下,為100,000以下更佳,為80,000以下再更佳,為50,000以下又更佳。藉由設為前述上限值以下,會有將預浸體或樹脂片疊層於電路形成基板時不易造成填埋不良的傾向。 以重量平均分子量Mw和數目平均分子量Mn之比所表示之單分散度(Mw/Mn),宜為100以下,為50以下更佳,為20以下再更佳。下限值為1.1以上較實際,宜為5以上,為7以上更佳,為10以上再更佳。 上述Mw及Mn係依循後述實施例之記載進行測定。 本實施形態之樹脂組成物含有2種以上之具有式(V)表示之構成單元的聚合物(V)時,混合物的Mw、Mn以及Mw/Mn宜符合上述範圍。 The molecular weight of the polymer (V) having the structural unit represented by the formula (V) is preferably 300 or more in terms of number average molecular weight Mn, more preferably 500 or more, more preferably 1,000 or more, still more preferably 1,500 or more. The upper limit is preferably below 130,000, preferably below 120,000, preferably below 110,000, and preferably below 100,000. The molecular weight of the polymer (V) having the structural unit represented by the formula (V) is preferably at least 3,000, more preferably at least 5,000, more preferably at least 10,000 in terms of weight average molecular weight Mw. By setting the value to be not less than the aforementioned lower limit, the excellent low dielectric properties (Dk and/or Df), especially Df, the dielectric properties after moisture absorption are effectively exerted. The upper limit is preferably below 130,000, preferably below 100,000, preferably below 80,000, and preferably below 50,000. By setting it below the above-mentioned upper limit, there is a tendency that filling defects are less likely to occur when the prepreg or resin sheet is laminated on a circuit forming substrate. The monodispersity (Mw/Mn) expressed as the ratio of the weight average molecular weight Mw and the number average molecular weight Mn is preferably 100 or less, more preferably 50 or less, and still more preferably 20 or less. It is more practical for the lower limit value to be 1.1 or more, preferably 5 or more, more preferably 7 or more, and even more preferably 10 or more. The above-mentioned Mw and Mn were measured according to the description of the Examples mentioned later. When the resin composition of the present embodiment contains two or more types of polymers (V) having structural units represented by formula (V), the Mw, Mn and Mw/Mn of the mixture are preferably within the above ranges.
具有式(V)表示之構成單元的聚合物(V)之乙烯基的當量,宜為200g/eq.以上,為230g/eq.以上更佳,為250g/eq.以上再更佳。又,乙烯基的當量宜為1200g/eq.以下,為1000g/eq.以下更佳,此外,也可為800g/eq.以下、600g/eq.以下、400g/eq.以下、300g/eq.以下。藉由設為前述下限值以上,會有改善樹脂組成物之保存安定性,並改善樹脂組成物之流動性的傾向。因此,會有改善成形性,且在預浸體等之形成時不易產生空隙,可獲得可靠性更高之印刷配線板的傾向。另一方面,藉由設為上述上限值以下,會有改善得到的硬化物之耐熱性的傾向。The equivalent weight of the vinyl group of the polymer (V) having the structural unit represented by the formula (V) is preferably 200 g/eq. or more, more preferably 230 g/eq. or more, and still more preferably 250 g/eq. or more. In addition, the vinyl equivalent weight is preferably 1200 g/eq. or less, more preferably 1000 g/eq. or less. In addition, it may be 800 g/eq. or less, 600 g/eq. or less, 400 g/eq. the following. By setting it to the above lower limit value or more, the storage stability of the resin composition will tend to be improved, and the fluidity of the resin composition will tend to be improved. Therefore, the formability is improved, and voids are less likely to occur during the formation of prepregs and the like, and a printed wiring board with higher reliability tends to be obtained. On the other hand, by setting it below the above-mentioned upper limit, the heat resistance of the obtained hardened material tends to be improved.
針對本說明書中具有式(V)表示之構成單元的聚合物(V),可參照國際公開第2017/115813號之段落0029~0058所記載之化合物及其合成反應條件等、日本特開2018-039995號公報之段落0013~0058所記載之化合物及其合成反應條件等、日本特開2018-168347號公報之段落0008~0043所記載之化合物及其合成反應條件等、日本特開2006-070136號公報之段落0014~0042所記載之化合物及其合成反應條件等、日本特開2006-089683號公報之段落0014~0061所記載之化合物及其合成反應條件等、日本特開2008-248001號公報之段落0008~0036所記載之化合物及其合成反應條件等,並納入本說明書中。Regarding the polymer (V) having the structural unit represented by the formula (V) in this specification, reference can be made to the compounds and their synthesis reaction conditions described in International Publication No. 2017/115813, paragraphs 0029 to 0058, Japanese Patent Application Laid-Open No. 2018- The compounds described in paragraphs 0013 to 0058 of Japanese Patent Application Publication No. 039995 and their synthesis reaction conditions, etc., the compounds and their synthesis reaction conditions, etc. described in paragraphs 0008 to 0043 of Japanese Patent Application Laid-Open No. 2018-168347, and their synthesis reaction conditions, etc., Japanese Patent Application Laid-Open No. 2006-070136 The compounds described in paragraphs 0014 to 0042 of the publication and their synthesis reaction conditions, etc., the compounds and their synthesis reaction conditions, etc. described in paragraphs 0014 to 0061 of Japanese Patent Application Laid-Open No. 2006-089683, the compounds and their synthesis reaction conditions, etc., described in Japanese Patent Application Laid-Open No. 2008-248001 The compounds and their synthesis reaction conditions described in paragraphs 0008 to 0036 are incorporated into this specification.
本實施形態之樹脂組成物中,令樹脂組成物中之樹脂固體成分為100質量份時,具有式(V)表示之構成單元的聚合物(V)的含量宜為5~50質量份。In the resin composition of this embodiment, when the resin solid content in the resin composition is 100 parts by mass, the content of the polymer (V) having the structural unit represented by formula (V) is preferably 5 to 50 parts by mass.
具有式(V)表示之構成單元的聚合物(V)的含量之下限值,在令樹脂組成物中之樹脂固體成分為100質量份時,為7質量份以上更佳,為9質量份以上再更佳,為10質量份以上又更佳,為15質量份以上再更佳。另一方面,具有式(V)表示之構成單元的聚合物(V)的含量之上限值,在令樹脂組成物中之樹脂固體成分為100質量份時,為45質量份以下更佳,為40質量份以下再更佳,為35質量份以下又更佳,也可為30質量份以下,亦可為25質量份以下。藉由將具有式(V)表示之構成單元的聚合物(V)的含量設為上述下限值以上,會有得到的硬化物之低介電特性(Dk及/或Df)、除膠渣耐性優良的傾向。又,藉由設為前述上限值以下,可有效地提高得到的硬化物之金屬箔剝離強度、吸濕耐熱性。The lower limit of the content of the polymer (V) having the structural unit represented by the formula (V) is 7 parts by mass or more, more preferably 9 parts by mass, when the resin solid content in the resin composition is 100 parts by mass. More preferably, it is more than 10 parts by mass, still more preferably 15 parts by mass or more. On the other hand, the upper limit of the content of the polymer (V) having the structural unit represented by the formula (V) is more preferably 45 parts by mass or less when the resin solid content in the resin composition is 100 parts by mass. It is more preferably 40 parts by mass or less, more preferably 35 parts by mass or less. It may be 30 parts by mass or less, or it may be 25 parts by mass or less. By setting the content of the polymer (V) having the structural unit represented by the formula (V) to be equal to or higher than the above lower limit, the cured product obtained will have low dielectric properties (Dk and/or Df) and good desmear properties. The tendency to have excellent patience. Moreover, by making it below the said upper limit, the metal foil peeling strength and moisture absorption heat resistance of the obtained hardened material can be effectively improved.
又,具有式(V)表示之構成單元的聚合物(V)的含量之下限值相對於式(M)表示之化合物(M)100質量份,宜為20質量份以上,為30質量份以上更佳,為40質量份以上再更佳,為50質量份以上又更佳,此外,宜為60質量份以上、70質量份以上、75質量份以上、80質量份以上,因應用途等亦可為85質量份以上、90質量份以上、95質量份以上。另一方面,具有式(V)表示之構成單元的聚合物(V)的含量之上限值相對於式(M)表示之化合物(M)100質量份,宜為600質量份以下,為500質量份以下更佳,為400質量份以下再更佳,為300質量份以下又更佳,此外,宜為200質量份以下、170質量份以下、150質量份以下、140質量份以下、130質量份以下、125質量份以下,因應用途等亦可為120質量份以下、115質量份以下、110質量份以下、105質量份以下。藉由將具有式(V)表示之構成單元的聚合物(V)的含量範圍調整至上述範圍,會有低介電特性(Dk及/或Df,尤其低介電損耗正切)、金屬箔剝離強度、除膠渣耐性、吸濕耐熱性優良的傾向。 具有式(V)表示之構成單元的聚合物(V),在樹脂組成物中,可僅含1種,也可含有2種以上。含有2種以上時,合計量宜成為上述範圍。 In addition, the lower limit of the content of the polymer (V) having the structural unit represented by the formula (V) is preferably 20 parts by mass or more and 30 parts by mass per 100 parts by mass of the compound (M) represented by the formula (M). The above is more preferably 40 parts by mass or more, still more preferably 50 parts by mass or more. In addition, it is preferably 60 parts by mass or more, 70 parts by mass or more, 75 parts by mass or more, or 80 parts by mass or more, depending on the use. It may be 85 parts by mass or more, 90 parts by mass or more, or 95 parts by mass or more. On the other hand, the upper limit of the content of the polymer (V) having the structural unit represented by the formula (V) is preferably 600 parts by mass or less and 500 parts by mass per 100 parts by mass of the compound (M) represented by the formula (M). Parts by mass or less are more preferred, parts by mass or less is still more preferred, parts by mass or less is still more preferred, and parts by mass or less are preferably 200 parts by mass or less, 170 parts by mass or less, 150 parts by mass or less, 140 parts by mass or less, and 130 parts by mass or less. Parts by mass or less, 125 parts by mass or less, depending on the use, etc., may be 120 parts by mass or less, 115 parts by mass or less, 110 parts by mass or less, or 105 parts by mass or less. By adjusting the content range of the polymer (V) having the structural unit represented by the formula (V) to the above range, there will be low dielectric properties (Dk and/or Df, especially low dielectric loss tangent) and metal foil peeling. Tends to have excellent strength, slag removal resistance, and moisture absorption and heat resistance. The resin composition may contain only one type of polymer (V) having a structural unit represented by formula (V), or may contain two or more types. When two or more types are contained, the total amount is preferably within the above range.
<式(M1)表示之化合物(M1)> 本實施形態之樹脂組成物含有式(M1)表示之化合物(M1)。藉由和上述式(M)表示之化合物(M)合併使用,硬化反應會適當地進行,並改善得到的樹脂組成物乃至硬化物等之耐熱性、吸濕耐熱性。 [化25] 式(M1)中,R M1、R M2、R M3及R M4分別獨立地表示氫原子或有機基。R M5及R M6分別獨立地表示氫原子或烷基。Ar M表示2價芳香族基。A為4~6員環之脂環基。R M7及R M8分別獨立地為烷基。mx為1或2,lx為0或1。R M9及R M10分別獨立地表示氫原子或烷基。R M11、R M12、R M13及R M14分別獨立地表示氫原子或有機基。R M15分別獨立地表示碳數1~10之烷基、碳數1~10之烷基氧基、碳數1~10之烷基硫代基、碳數6~10之芳基、碳數6~10之芳氧基、碳數6~10之芳基硫代基、鹵素原子、羥基或巰基。px表示0~3之整數。nx表示1~20之整數。 <Compound (M1) represented by formula (M1)> The resin composition of this embodiment contains the compound (M1) represented by formula (M1). By using it in combination with the compound (M) represented by the above formula (M), the curing reaction proceeds appropriately, and the heat resistance and moisture absorption heat resistance of the obtained resin composition and even the cured product are improved. [Chemical 25] In formula (M1), R M1 , R M2 , R M3 and R M4 each independently represent a hydrogen atom or an organic group. R M5 and R M6 each independently represent a hydrogen atom or an alkyl group. Ar M represents a divalent aromatic group. A is an alicyclic group with 4 to 6 members. R M7 and R M8 are each independently an alkyl group. mx is 1 or 2, lx is 0 or 1. R M9 and R M10 each independently represent a hydrogen atom or an alkyl group. RM11 , RM12 , RM13 and RM14 each independently represent a hydrogen atom or an organic group. R M15 independently represents an alkyl group having 1 to 10 carbon atoms, an alkyloxy group having 1 to 10 carbon atoms, an alkylthio group having 1 to 10 carbon atoms, an aryl group having 6 to 10 carbon atoms, or an aryl group having 6 carbon atoms. An aryloxy group with ∼10 carbon atoms, an arylthio group with 6 to 10 carbon atoms, a halogen atom, a hydroxyl group or a mercapto group. px represents an integer from 0 to 3. nx represents an integer from 1 to 20.
式中之R M1、R M2、R M3及R M4分別獨立地表示氫原子或有機基。在此之有機基宜為烷基,為碳數1~12之烷基更佳,為碳數1~6之烷基再更佳,為甲基、乙基、丙基、丁基又更佳,其中為甲基特佳。R M1及R M3分別獨立地宜為烷基,R M2及R M4宜為氫原子。 R M5及R M6分別獨立表示氫原子或烷基,宜為烷基。在此之烷基宜為碳數1~12之烷基,為碳數1~6之烷基更佳,為甲基、乙基、丙基、丁基再更佳,其中為甲基特佳。 Ar M表示2價芳香族基,宜為伸苯基、萘二基、菲二基、蒽二基,為伸苯基更佳,為間伸苯基再更佳。Ar M也可具有取代基,取代基宜為烷基,為碳數1~12之烷基更佳,為碳數1~6之烷基再更佳,為甲基、乙基、丙基、丁基又更佳,為甲基特佳。但是,Ar M宜為無取代。 A為4~6員環之脂環基,為5員之脂環基(宜為和苯環合併成為二氫茚環之基)更佳。R M7及R M8分別獨立地為烷基,宜為碳數1~6之烷基,為碳數1~3之烷基更佳,為甲基特佳。 mx為1或2,宜為2。 lx為0或1,宜為1。 R M9及R M10分別獨立地表示氫原子或烷基,為烷基更佳。在此之烷基宜為碳數1~12之烷基,為碳數1~6之烷基更佳,為甲基、乙基、丙基、丁基再更佳,其中,為甲基特佳。 R M11、R M12、R M13及R M14分別獨立地表示氫原子或有機基。在此之有機基宜為烷基,為碳數1~12之烷基更佳,為碳數1~6之烷基再更佳,為甲基、乙基、丙基、丁基又更佳,其中,為甲基特佳。R M12及R M13分別獨立宜為烷基,R M11及R M14宜為氫原子。 R M15分別獨立表示碳數1~10之烷基、碳數1~10之烷基氧基、碳數1~10之烷基硫代基、碳數6~10之芳基、碳數6~10之芳氧基、碳數6~10之芳基硫代基、鹵素原子、羥基或巰基,宜為碳數1~4之烷基、碳數3~6之環烷基、或碳數6~10之芳基。 px表示0~3之整數,宜為0~2之整數,為0或1更佳,為0再更佳。 nx表示1~20之整數。nx亦可為10以下之整數。 另外,本實施形態之樹脂組成物可僅含1種式(M1)表示之化合物(M1)且至少nx之值不同的化合物,也可含有2種以上。含有2種以上時,樹脂組成物中之式(M1)表示之化合物(M1)中的nx之平均值(平均重複單元數)n,為了製成低熔點(低軟化點)且熔融黏度低、操作性優良者,宜為0.92以上,為0.95以上更佳,為1.0以上再更佳,為1.1以上又更佳。又,n宜為10.0以下,為8.0以下更佳,為7.0以下再更佳,為6.0以下又更佳,也可為5.0以下。針對後述式(M1-2)等亦同樣。 RM1 , RM2 , RM3 and RM4 in the formula each independently represent a hydrogen atom or an organic group. The organic group here is preferably an alkyl group, more preferably an alkyl group having 1 to 12 carbon atoms, even more preferably an alkyl group having 1 to 6 carbon atoms, and even more preferably a methyl, ethyl, propyl or butyl group. , of which methyl is particularly preferred. R M1 and R M3 are preferably each independently an alkyl group, and R M2 and R M4 are preferably hydrogen atoms. R M5 and R M6 respectively independently represent a hydrogen atom or an alkyl group, preferably an alkyl group. The alkyl group here is preferably an alkyl group having 1 to 12 carbon atoms, more preferably an alkyl group having 1 to 6 carbon atoms, more preferably a methyl group, an ethyl group, a propyl group, or a butyl group, and particularly preferably a methyl group. . Ar M represents a divalent aromatic group, and is preferably a phenylene group, naphthalenediyl, phenanthrenediyl, or anthracenediyl group, more preferably a phenylene group, and even more preferably a m-phenylene group. Ar M may also have a substituent, and the substituent is preferably an alkyl group, preferably an alkyl group with 1 to 12 carbon atoms, and even more preferably an alkyl group with 1 to 6 carbon atoms, such as methyl, ethyl, propyl, Butyl is more preferred, and methyl is particularly preferred. However, Ar M is preferably unsubstituted. A is a 4- to 6-membered alicyclic group, preferably a 5-membered alicyclic group (preferably a group that combines with a benzene ring to form an indene ring). R M7 and R M8 are each independently an alkyl group, preferably an alkyl group having 1 to 6 carbon atoms, more preferably an alkyl group having 1 to 3 carbon atoms, and particularly preferably a methyl group. mx is 1 or 2, preferably 2. lx is 0 or 1, preferably 1. R M9 and R M10 each independently represent a hydrogen atom or an alkyl group, preferably an alkyl group. The alkyl group here is preferably an alkyl group having 1 to 12 carbon atoms, more preferably an alkyl group having 1 to 6 carbon atoms, and more preferably a methyl, ethyl, propyl, or butyl group, of which methyl is particularly good. RM11 , RM12 , RM13 and RM14 each independently represent a hydrogen atom or an organic group. The organic group here is preferably an alkyl group, more preferably an alkyl group having 1 to 12 carbon atoms, even more preferably an alkyl group having 1 to 6 carbon atoms, and even more preferably a methyl, ethyl, propyl or butyl group. , among which, methyl is particularly preferred. R M12 and R M13 are each independently preferably an alkyl group, and R M11 and R M14 are preferably hydrogen atoms. R M15 independently represents an alkyl group with 1 to 10 carbon atoms, an alkyloxy group with 1 to 10 carbon atoms, an alkylthio group with 1 to 10 carbon atoms, an aryl group with 6 to 10 carbon atoms, and an aryl group with 6 to 10 carbon atoms. The aryloxy group of 10, the arylthio group with 6 to 10 carbon atoms, the halogen atom, the hydroxyl group or the mercapto group is preferably an alkyl group with 1 to 4 carbon atoms, a cycloalkyl group with 3 to 6 carbon atoms, or 6 carbon atoms. ~10 of the aryl group. px represents an integer from 0 to 3, preferably an integer from 0 to 2, preferably 0 or 1, and even more preferably 0. nx represents an integer from 1 to 20. nx can also be an integer below 10. In addition, the resin composition of this embodiment may contain only one type of compound (M1) represented by formula (M1) and which have at least different values of nx, or may contain two or more types. When two or more types are contained, the average value (average number of repeating units) n of nx in the compound (M1) represented by the formula (M1) in the resin composition is used to obtain a low melting point (low softening point) and low melt viscosity. For excellent operability, it should be 0.92 or more, more preferably 0.95 or more, more preferably 1.0 or more, still more preferably 1.1 or more. In addition, n is preferably 10.0 or less, more preferably 8.0 or less, more preferably 7.0 or less, more preferably 6.0 or less, or 5.0 or less. The same applies to the following formula (M1-2) and the like.
式(M1)表示之化合物(M1)宜為下述式(M1-1)表示之化合物。 [化26] 式(M1-1)中,R M21、R M22、R M23、及R M24分別獨立地表示氫原子或有機基。R M25及R M26分別獨立地表示氫原子或烷基。R M27、R M28、R M29、及R M30分別獨立地表示氫原子或有機基。R M31及R M32分別獨立地表示氫原子或烷基。R M33、R M34、R M35、及R M36分別獨立地表示氫原子或有機基。R M37、R M38、及R M39分別獨立地表示氫原子或烷基。nx表示1以上且20以下之整數。 The compound (M1) represented by the formula (M1) is preferably a compound represented by the following formula (M1-1). [Chemical 26] In formula (M1-1), RM21 , RM22 , RM23 , and RM24 each independently represent a hydrogen atom or an organic group. R M25 and R M26 each independently represent a hydrogen atom or an alkyl group. RM27 , RM28 , RM29 , and RM30 each independently represent a hydrogen atom or an organic group. R M31 and R M32 each independently represent a hydrogen atom or an alkyl group. RM33 , RM34 , RM35 , and RM36 each independently represent a hydrogen atom or an organic group. RM37 , RM38 , and RM39 each independently represent a hydrogen atom or an alkyl group. nx represents an integer from 1 to 20.
式中之R M21、R M22、R M23、及R M24分別獨立地表示氫原子或有機基。在此之有機基宜為烷基,為碳數1~12之烷基更佳,為碳數1~6之烷基再更佳,為甲基、乙基、丙基、丁基又更佳,為甲基特佳。R M21及R M23宜為烷基,R M22及R M24宜為氫原子。 R M25及R M26分別獨立地表示氫原子或烷基,宜為烷基。在此之烷基宜為碳數1~12之烷基,為碳數1~6之烷基更佳,為甲基、乙基、丙基、丁基再更佳,其中,為甲基特佳。 R M27、R M28、R M29、及R M30分別獨立地表示氫原子或有機基,宜為氫原子。在此之有機基宜為烷基,為碳數1~12之烷基更佳,為碳數1~6之烷基再更佳,為甲基、乙基、丙基、丁基又更佳,為甲基特佳。 R M31及R M32分別獨立地表示氫原子或烷基,宜為烷基。在此之烷基宜為碳數1~12之烷基,為碳數1~6之烷基更佳,為甲基、乙基、丙基、丁基再更佳,其中,為甲基特佳。 R M33、R M34、R M35、及R M36分別獨立地表示氫原子或有機基。在此之有機基宜為烷基,為碳數1~12之烷基更佳,為碳數1~6之烷基再更佳,為甲基、乙基、丙基、丁基又更佳,為甲基特佳。 R M33及R M36宜為氫原子,R M34及R M35宜為烷基。 R M37、R M38、及R M39分別獨立地表示氫原子或烷基,宜為烷基。在此之烷基宜為碳數1~12之烷基,為碳數1~6之烷基更佳,為甲基、乙基、丙基、丁基再更佳,其中,為甲基特佳。 nx表示1以上且20以下之整數。nx亦可為10以下之整數。 RM21 , RM22 , RM23 , and RM24 in the formula each independently represent a hydrogen atom or an organic group. The organic group here is preferably an alkyl group, more preferably an alkyl group having 1 to 12 carbon atoms, even more preferably an alkyl group having 1 to 6 carbon atoms, and even more preferably a methyl, ethyl, propyl or butyl group. , which is particularly good for methyl. R M21 and R M23 are preferably alkyl groups, and R M22 and R M24 are preferably hydrogen atoms. R M25 and R M26 each independently represent a hydrogen atom or an alkyl group, preferably an alkyl group. The alkyl group here is preferably an alkyl group having 1 to 12 carbon atoms, more preferably an alkyl group having 1 to 6 carbon atoms, and more preferably a methyl, ethyl, propyl, or butyl group, of which methyl is particularly good. RM27 , RM28 , RM29 , and RM30 each independently represent a hydrogen atom or an organic group, and are preferably a hydrogen atom. The organic group here is preferably an alkyl group, more preferably an alkyl group having 1 to 12 carbon atoms, even more preferably an alkyl group having 1 to 6 carbon atoms, and even more preferably a methyl, ethyl, propyl or butyl group. , which is particularly good for methyl. R M31 and R M32 each independently represent a hydrogen atom or an alkyl group, preferably an alkyl group. The alkyl group here is preferably an alkyl group having 1 to 12 carbon atoms, more preferably an alkyl group having 1 to 6 carbon atoms, and more preferably a methyl, ethyl, propyl, or butyl group, of which methyl is particularly good. RM33 , RM34 , RM35 , and RM36 each independently represent a hydrogen atom or an organic group. The organic group here is preferably an alkyl group, more preferably an alkyl group having 1 to 12 carbon atoms, even more preferably an alkyl group having 1 to 6 carbon atoms, and even more preferably a methyl, ethyl, propyl or butyl group. , which is particularly good for methyl. R M33 and R M36 are preferably hydrogen atoms, and R M34 and R M35 are preferably alkyl groups. RM37 , RM38 , and RM39 each independently represent a hydrogen atom or an alkyl group, preferably an alkyl group. The alkyl group here is preferably an alkyl group having 1 to 12 carbon atoms, more preferably an alkyl group having 1 to 6 carbon atoms, and more preferably a methyl, ethyl, propyl, or butyl group, of which methyl is particularly good. nx represents an integer from 1 to 20. nx can also be an integer below 10.
式(M1-1)表示之化合物宜為下式(M1-2)表示之化合物。 [化27] 式(M1-2)中,R M21、R M22、R M23、及R M24分別獨立地表示氫原子或有機基。R M25及R M26分別獨立地表示氫原子或烷基。R M27、R M28、R M29、及R M30分別獨立地表示氫原子或有機基。R M31及R M32分別獨立地表示氫原子或烷基。R M33、R M34、R M35、及R M36分別獨立地表示氫原子或有機基。R M37、R M38、及R M39分別獨立地表示氫原子或烷基。nx表示1以上且20以下之整數。 The compound represented by formula (M1-1) is preferably a compound represented by the following formula (M1-2). [Chemical 27] In formula (M1-2), RM21 , RM22 , RM23 , and RM24 each independently represent a hydrogen atom or an organic group. R M25 and R M26 each independently represent a hydrogen atom or an alkyl group. RM27 , RM28 , RM29 , and RM30 each independently represent a hydrogen atom or an organic group. R M31 and R M32 each independently represent a hydrogen atom or an alkyl group. RM33 , RM34 , RM35 , and RM36 each independently represent a hydrogen atom or an organic group. RM37 , RM38 , and RM39 each independently represent a hydrogen atom or an alkyl group. nx represents an integer from 1 to 20.
式(M1-2)中,R M21、R M22、R M23、R M24、R M25、R M26、R M27、R M28、R M29、R M30、R M31、R M32、R M33、R M34、R M35、R M36、R M37、R M38、R M39、及nx分別和式(M1-1)中的R M21、R M22、R M23、R M24、R M25、R M26、R M27、R M28、R M29、R M30、R M31、R M32、R M33、R M34、R M35、R M36、R M37、R M38、R M39、及nx同義,理想的範圍亦同樣。 In formula (M1-2), RM21 , RM22 , RM23 , RM24 , RM25 , RM26 , RM27 , RM28 , RM29 , RM30 , RM31 , RM32 , RM33 , RM34 , RM35 , RM36 , RM37 , RM38 , RM39 , and nx are respectively the same as RM21 , RM22 , RM23, RM24 , RM25 , RM26 , RM27 , RM28 in formula ( M1-1 ) , RM29 , RM30 , RM31 , RM32 , RM33 , RM34 , RM35 , RM36 , RM37, RM38 , RM39 , and nx are synonymous, and the ideal range is also the same.
式(M1-1)表示之化合物宜為下式(M1-3)表示之化合物,為下式(M1-4)表示之化合物更佳。 [化28] 式(M1-3)中,nx表示1以上且20以下之整數。 nx亦可為10以下之整數。 [化29] 式(M1-4)中,nx表示1以上且20以下之整數。 nx亦可為10以下之整數。 The compound represented by formula (M1-1) is preferably a compound represented by the following formula (M1-3), and more preferably a compound represented by the following formula (M1-4). [Chemical 28] In Formula (M1-3), nx represents an integer from 1 to 20. nx can also be an integer below 10. [Chemical 29] In Formula (M1-4), nx represents an integer from 1 to 20. nx can also be an integer below 10.
式(M1)表示之化合物(M1)之分子量宜為500以上,為600以上更佳,為700以上再更佳。藉由設為前述下限值以上,會有得到的硬化物之低介電特性(Dk及/或Df)及低吸水性更為改善的傾向。又,式(M1)表示之化合物(M1)之分子量宜為10000以下,為9000以下更佳,為7000以下再更佳,為5000以下又更佳,為4000以下再更佳。藉由設為前述上限值以下,會有得到的硬化物之耐熱性及操作性更為改善的傾向。The molecular weight of the compound (M1) represented by the formula (M1) is preferably 500 or more, more preferably 600 or more, and still more preferably 700 or more. By setting it to above the lower limit, the low dielectric properties (Dk and/or Df) and low water absorption of the obtained cured product tend to be further improved. Furthermore, the molecular weight of the compound (M1) represented by the formula (M1) is preferably 10,000 or less, more preferably 9,000 or less, still more preferably 7,000 or less, more preferably 5,000 or less, still more preferably 4,000 or less. By setting it below the aforementioned upper limit, the heat resistance and workability of the obtained cured product tend to be further improved.
本實施形態之樹脂組成物中,令樹脂組成物中之樹脂固體成分為100質量份時,式(M1)表示之化合物(M1)的含量宜為5~50質量份。式(M1)表示之化合物(M1)的含量之下限值,在令樹脂組成物中之樹脂固體成分為100質量份時,宜為5質量份以上,為7質量份以上更佳,為9質量份以上再更佳,為10質量份以上又更佳,為15質量份以上再更佳。另一方面,式(M1)表示之化合物(M1)的含量之上限值,在令樹脂組成物中之樹脂固體成分為100質量份時,宜為50質量份以下,為40質量份以下更佳,為35質量份以下再更佳,也可為30質量份以下,亦可為25質量份以下。藉由將式(M1)表示之化合物(M1)設為上述下限值以上,會有得到的硬化物之耐熱性、吸濕耐熱性優良的傾向。又,藉由設為前述上限值以下,可將得到的硬化物之金屬箔剝離強度、除膠渣耐性有效地調至良好的範圍。In the resin composition of this embodiment, when the resin solid content in the resin composition is 100 parts by mass, the content of the compound (M1) represented by the formula (M1) is preferably 5 to 50 parts by mass. The lower limit of the content of the compound (M1) represented by the formula (M1) is preferably 5 parts by mass or more, more preferably 7 parts by mass or more, and is 9 when the resin solid content in the resin composition is 100 parts by mass. It is more preferably not less than 10 parts by mass, and more preferably not less than 15 parts by mass. On the other hand, the upper limit of the content of the compound (M1) represented by the formula (M1) is preferably 50 parts by mass or less, and more preferably 40 parts by mass or less when the resin solid content in the resin composition is 100 parts by mass. Preferably, it is 35 parts by mass or less, even more preferably, it may be 30 parts by mass or less, or it may be 25 parts by mass or less. By setting the compound (M1) represented by the formula (M1) to be equal to or more than the above lower limit, the obtained cured product tends to be excellent in heat resistance and moisture absorption heat resistance. Moreover, by setting it below the said upper limit value, the metal foil peeling strength and the desmear resistance of the hardened material obtained can be effectively adjusted to a favorable range.
又,式(M1)表示之化合物(M1)的含量之下限值相對於式(M)表示之化合物(M)100質量份,宜為10質量份以上,為20質量份以上更佳,為30質量份以上再更佳,為60質量份以上又更佳,為70質量份以上再更佳,為80質量份以上又更佳,為85質量份以上再更佳,為90質量份以上特佳,亦可為95質量份以上。另一方面,式(M1)表示之化合物(M1)的含量之上限值相對於式(M)表示之化合物(M)100質量份,宜為600質量份以下,為500質量份以下更佳,為400質量份以下再更佳,為300質量份以下又更佳,此外,宜為200質量份以下、170質量份以下、150質量份以下、140質量份以下、130質量份以下、125質量份以下,因應用途等亦可為120質量份以下、115質量份以下、110質量份以下、105質量份以下。藉由將式(M1)表示之化合物(M1)的含量範圍調整至上述範圍,會有低介電特性(Dk及/或Df,尤其低介電損耗正切)、金屬箔剝離強度、除膠渣耐性、吸濕耐熱性優良的傾向。 式(M1)表示之化合物(M1),在樹脂組成物中,可僅含1種,也可含有2種以上。含有2種以上時,合計量宜成為上述範圍。 Moreover, the lower limit value of the content of the compound (M1) represented by the formula (M1) is preferably 10 parts by mass or more, more preferably 20 parts by mass or more per 100 parts by mass of the compound (M) represented by the formula (M), and is More preferably 30 parts by mass or more, more preferably 60 parts by mass or more, more preferably 70 parts by mass or more, more than 80 parts by mass still more preferably, 85 parts by mass or more, particularly 90 parts by mass or more Preferably, it can also be more than 95 parts by mass. On the other hand, the upper limit of the content of the compound (M1) represented by the formula (M1) is preferably 600 parts by mass or less, and more preferably 500 parts by mass or less per 100 parts by mass of the compound (M) represented by the formula (M). , more preferably not more than 400 parts by mass, more preferably not more than 300 parts by mass, and preferably not more than 200 parts by mass, not more than 170 parts by mass, not more than 150 parts by mass, not more than 140 parts by mass, not more than 130 parts by mass, and not more than 125 parts by mass Parts or less may be 120 parts by mass or less, 115 parts by mass or less, 110 parts by mass or less, or 105 parts by mass or less depending on the use. By adjusting the content range of the compound (M1) represented by the formula (M1) to the above range, there will be low dielectric properties (Dk and/or Df, especially low dielectric loss tangent), metal foil peeling strength, and desmear removal. Tends to have excellent resistance to moisture absorption and heat resistance. The resin composition may contain only one type of compound (M1) represented by formula (M1) or two or more types. When two or more types are contained, the total amount is preferably within the above range.
本實施形態之樹脂組成物中,就式(M)表示之化合物(M)及具有式(V)表示之構成單元的聚合物(V)及式(M1)表示之化合物(M1)的含量之質量比率而言,具有式(V)表示之構成單元的聚合物(V)、及式(M1)表示之化合物(M1)相對於式(M)表示之化合物(M)100質量份的比率宜為30~130:90~400,為40~130:90~300更佳,為70~130:90~140又更佳,為70~110:90~110再更佳,為90~105:90~105又更佳。藉由調整它們的摻混比,可使樹脂組成物之硬化良好地進行,且可更降低Df,又,可更為改善耐除膠渣性。 又,本實施形態之樹脂組成物中,以式(M1)表示之化合物(M1)的含量/具有式(V)表示之構成單元的聚合物(V)的含量表示之比,宜為3.0以下,為2.5以下更佳,為2.0以下再更佳,為1.8以下又更佳,又,宜為0.5以上,為0.8以上更佳。藉由調整如此的摻混比,可使樹脂組成物之硬化良好地進行,且可更降低Df,又,可更為改善耐除膠渣性。 In the resin composition of this embodiment, the content of the compound (M) represented by the formula (M), the polymer (V) having the structural unit represented by the formula (V), and the compound (M1) represented by the formula (M1) is In terms of mass ratio, the ratio of the polymer (V) having the structural unit represented by the formula (V) and the compound (M1) represented by the formula (M1) relative to 100 parts by mass of the compound (M) represented by the formula (M) is suitable. 30 to 130: 90 to 400, 40 to 130: 90 to 300 is better, 70 to 130: 90 to 140 is better, 70 to 110: 90 to 110 is even better, 90 to 105:90 ~105 is even better. By adjusting their blending ratio, the hardening of the resin composition can be progressed favorably, Df can be further reduced, and the desmear resistance can be further improved. Furthermore, in the resin composition of this embodiment, the ratio expressed by the content of the compound (M1) represented by the formula (M1)/the content of the polymer (V) having the structural unit represented by the formula (V) is preferably 3.0 or less. , is preferably 2.5 or less, more preferably 2.0 or less, more preferably 1.8 or less, and preferably 0.5 or more, more preferably 0.8 or more. By adjusting such a blending ratio, hardening of the resin composition can be progressed favorably, Df can be further reduced, and desmear resistance can be further improved.
<其它熱硬化性化合物(C)> 本實施形態之樹脂組成物也可更含有選自由式(M)表示之化合物(M)及式(M1)表示之化合物(M1)以外的馬來醯亞胺化合物、環氧化合物、酚化合物、氧雜環丁烷樹脂、苯并㗁𠯤化合物、含有(甲基)烯丙基之化合物(宜為烯基納迪克醯亞胺化合物)及含有2個以上之碳-碳不飽和雙鍵之聚苯醚化合物構成之群組中之1種以上之其它熱硬化性化合物(C)。藉由含有如此的成分,可使印刷配線板所要求的性能更有效地發揮。 <Other thermosetting compounds (C)> The resin composition of this embodiment may further contain a maleimide compound, an epoxy compound, a phenol compound selected from other than the compound (M) represented by the formula (M) and the compound (M1) represented by the formula (M1). Oxetane resins, benzodiazepine compounds, compounds containing (meth)allyl groups (preferably alkenyl nadic acid imine compounds) and polymers containing more than 2 carbon-carbon unsaturated double bonds One or more other thermosetting compounds (C) from the group consisting of phenylene ether compounds. By containing such components, the performance required by the printed wiring board can be exerted more effectively.
<<式(M)表示之化合物(M)及式(M1)表示之化合物(M1)以外的馬來醯亞胺化合物>> 本實施形態之樹脂組成物中,也可含有式(M)表示之化合物(M)及式(M1)表示之化合物(M1)以外的馬來醯亞胺化合物。就本實施形態之樹脂組成物而言,若為1分子中具有1個以上(宜為2~12,為2~6更佳,為2~4再更佳,為2或3又更佳,為2再更佳)之馬來醯亞胺基的化合物,則無特別限制,可廣泛地使用印刷配線板之領域中常用的化合物。 本實施形態中,式(M)表示之化合物(M)及式(M1)表示之化合物(M1)以外的馬來醯亞胺化合物,宜包含選自由式(M2)表示之化合物、式(M3)表示之化合物、式(M4)表示之化合物、及馬來醯亞胺化合物(M6)構成之群組中之1種以上,包含選自由式(M2)表示之化合物、式(M3)表示之化合物、及式(M4)表示之化合物構成之群組中之1種以上更佳。 [化30] 式(M2)中,R 54分別獨立地表示氫原子或甲基,n 4表示1以上之整數。 n 4宜為1~10之整數,為1~5之整數更佳,為1~3之整數再更佳,為1或2又更佳。 式(M2)表示之化合物也可為n 4不同的化合物之混合物,宜為混合物。 [化31] 式(M3)中,R 55分別獨立表示為氫原子、碳數1~8之烷基或苯基,n 5表示1以上且10以下之整數。 R 55宜為氫原子、甲基、乙基、正丙基、異丙基、正丁基、異丁基、三級丁基、正戊基、苯基,為氫原子及甲基中之一者更佳,為氫原子再更佳。 n 5宜為1以上且5以下之整數,為1~3之整數再更佳,為1或2又更佳。 式(M3)表示之化合物也可為n 5不同的化合物之混合物,宜為混合物。 [化32] 式(M4)中,R 56分別獨立地表示氫原子、甲基或乙基,R 57分別獨立地表示氫原子或甲基。 <<Maleimide compounds other than the compound (M) represented by the formula (M) and the compound (M1) represented by the formula (M1) >> The resin composition of this embodiment may also contain the compound represented by the formula (M) Maleimide compounds other than compound (M) and compound (M1) represented by formula (M1). In the resin composition of this embodiment, if there are more than 1 in 1 molecule (preferably 2 to 12, more preferably 2 to 6, more preferably 2 to 4, more preferably 2 or 3, The maleimide-based compound (2 or more preferably) is not particularly limited, and compounds commonly used in the field of printed wiring boards can be widely used. In this embodiment, the maleimide compound other than the compound (M) represented by the formula (M) and the compound (M1) represented by the formula (M1) preferably includes a compound selected from the compound represented by the formula (M2), the compound represented by the formula (M3) ), a compound represented by formula (M4), and a maleimide compound (M6), including one selected from the group consisting of a compound represented by formula (M2), a compound represented by formula (M3) More preferably, one or more types from the group consisting of a compound and a compound represented by formula (M4). [Chemical 30] In the formula (M2), R 54 each independently represents a hydrogen atom or a methyl group, and n 4 represents an integer of 1 or more. n 4 is preferably an integer from 1 to 10, more preferably an integer from 1 to 5, even more preferably an integer from 1 to 3, even more preferably 1 or 2. The compound represented by formula (M2) may also be a mixture of n 4 different compounds, and is preferably a mixture. [Chemical 31] In the formula (M3), R 55 each independently represents a hydrogen atom, an alkyl group having 1 to 8 carbon atoms, or a phenyl group, and n 5 represents an integer from 1 to 10. R 55 is preferably a hydrogen atom, methyl, ethyl, n-propyl, isopropyl, n-butyl, isobutyl, tertiary butyl, n-pentyl, phenyl, and is one of hydrogen atom and methyl Even better, it is a hydrogen atom. n 5 is preferably an integer from 1 to 5, more preferably an integer from 1 to 3, more preferably 1 or 2. The compound represented by formula (M3) may also be a mixture of compounds with n 5 different compounds, and is preferably a mixture. [Chemical 32] In the formula (M4), R 56 each independently represents a hydrogen atom, a methyl group or an ethyl group, and R 57 each independently represents a hydrogen atom or a methyl group.
馬來醯亞胺化合物(M6)係具有式(M6)表示之構成單元及在分子鏈之兩末端具有馬來醯亞胺基之化合物。 [化33] 式(M6)中,R 61表示碳數1~16之直鏈狀或分支狀之伸烷基、或碳數2~16之直鏈狀或分支狀之伸烯基。R 62表示碳數1~16之直鏈狀或分支狀之伸烷基、或碳數2~16之直鏈狀或分支狀之伸烯基。R 63分別獨立地表示碳數1~16之直鏈狀或分支狀之烷基、或碳數2~16之直鏈狀或分支狀之烯基。n分別獨立地表示0~10之整數。 馬來醯亞胺化合物(M6)的詳細內容及其製造方法可參酌國際公開第2020/262577號之段落0061~0066的記載,並將其內容納入本說明書。 The maleimide compound (M6) is a compound having a structural unit represented by the formula (M6) and maleimide groups at both ends of the molecular chain. [Chemical 33] In formula (M6), R 61 represents a linear or branched alkylene group having 1 to 16 carbon atoms, or a linear or branched alkenylene group having 2 to 16 carbon atoms. R 62 represents a linear or branched alkylene group having 1 to 16 carbon atoms, or a linear or branched alkenylene group having 2 to 16 carbon atoms. R 63 each independently represents a linear or branched alkyl group having 1 to 16 carbon atoms, or a linear or branched alkenyl group having 2 to 16 carbon atoms. n each independently represents an integer from 0 to 10. For details of the maleimide compound (M6) and its production method, please refer to the descriptions in paragraphs 0061 to 0066 of International Publication No. 2020/262577, and the contents are incorporated into this specification.
式(M)表示之化合物(M)及式(M1)表示之化合物(M1)以外的馬來醯亞胺化合物可用公知的方法製造,也可使用市售品。市售品可列舉例如:作為式(M2)表示之化合物之大和化成工業公司製「BMI-2300」、作為式(M3)表示之化合物之日本化藥股份有限公司製「MIR-3000」、作為式(M4)表示之化合物之K・I化成公司製「BMI-70」、作為馬來醯亞胺化合物(M6)之日本化藥公司製「MIZ-001」。Maleimide compounds other than the compound (M) represented by the formula (M) and the compound (M1) represented by the formula (M1) can be produced by a known method, and commercial products can also be used. Examples of commercially available products include: "BMI-2300" manufactured by Yamato Chemical Industry Co., Ltd. as the compound represented by the formula (M2), "MIR-3000" manufactured by Nippon Kayaku Co., Ltd. as the compound represented by the formula (M3), The compound represented by formula (M4) is "BMI-70" manufactured by K・I Chemical Co., Ltd., and the maleimide compound (M6) is "MIZ-001" manufactured by Nippon Kayaku Co., Ltd.
又,上述以外的馬來醯亞胺化合物可例示具有2個以上之馬來醯亞胺基的化合物,具體可列舉:間苯雙馬來醯亞胺、2,2-雙(4-(4-馬來醯亞胺基苯氧基)-苯基)丙烷、4-甲基-1,3-伸苯基雙馬來醯亞胺、1,6-雙馬來醯亞胺基-(2,2,4-三甲基)己烷、4,4’-二苯基醚雙馬來醯亞胺、4,4’-二苯基碸雙馬來醯亞胺、1,3-雙(3-馬來醯亞胺基苯氧基)苯、1,3-雙(4-馬來醯亞胺基苯氧基)苯、及它們的預聚物、這些馬來醯亞胺與胺的預聚物等。Examples of maleimide compounds other than those mentioned above include compounds having two or more maleimide groups. Specific examples include: isophenyl bismaleimide, 2,2-bis(4-(4 -Maleimidophenoxy)-phenyl)propane, 4-methyl-1,3-phenylbismaleimide, 1,6-bismaleimino-(2 ,2,4-trimethyl)hexane, 4,4'-diphenyl ether bismaleimide, 4,4'-diphenyl ester bismaleimide, 1,3-bis( 3-maleiminophenoxy)benzene, 1,3-bis(4-maleiminophenoxy)benzene, and their prepolymers, and the combinations of these maleimides and amines Prepolymers, etc.
含有式(M)表示之化合物(M)及式(M1)表示之化合物(M1)以外的馬來醯亞胺化合物時,其含量之下限值相對於樹脂組成物中之樹脂固體成分100質量份,宜為1質量份以上,為5質量份以上更佳,為10質量份以上再更佳,也可為20質量份以上,亦可為25質量份以上。式(M)表示之化合物(M)及式(M1)表示之化合物(M1)以外的馬來醯亞胺化合物的含量藉由為1質量份以上,會有改善得到的硬化物之耐燃性的傾向。又,式(M)表示之化合物(M)及式(M1)表示之化合物(M1)以外的馬來醯亞胺化合物的含量之上限值相對於樹脂組成物中之樹脂固體成分100質量份,宜為50質量份以下,為40質量份以下更佳,也可為30質量份以下。式(M)表示之化合物(M)及式(M1)表示之化合物(M1)以外的馬來醯亞胺化合物的含量藉由為50質量份以下,會有改善得到的硬化物之金屬箔剝離強度及低吸水性的傾向。 本實施形態中的樹脂組成物可僅含1種式(M)表示之化合物(M)及式(M1)表示之化合物(M1)以外的馬來醯亞胺化合物,也可含有2種以上。含有2種以上時,合計量宜為上述範圍。 又,本實施形態中的樹脂組成物也可設為實質上不含式(M)表示之化合物(M)及式(M1)表示之化合物(M1)以外的馬來醯亞胺化合物之構成。實質上不含係指式(M)表示之化合物(M)及式(M1)表示之化合物(M1)以外的馬來醯亞胺化合物的含量相對於樹脂組成物中之樹脂固體成分100質量份未達1質量份,宜為未達0.1質量份,未達0.01質量份更佳。 When a maleimide compound other than the compound (M) represented by the formula (M) and the compound (M1) represented by the formula (M1) is contained, the lower limit of the content shall be based on 100 mass of the resin solid content in the resin composition. Parts are preferably 1 part by mass or more, more preferably 5 parts by mass or more, more preferably 10 parts by mass or more, 20 parts by mass or more, or 25 parts by mass or more. When the content of the maleimide compound other than the compound (M) represented by the formula (M) and the compound (M1) represented by the formula (M1) is 1 part by mass or more, the flame resistance of the obtained cured product will be improved. tendency. Moreover, the upper limit of the content of the maleimide compound other than the compound (M) represented by the formula (M) and the compound (M1) represented by the formula (M1) is based on 100 parts by mass of the resin solid content in the resin composition. , preferably 50 parts by mass or less, more preferably 40 parts by mass or less, and may also be 30 parts by mass or less. When the content of the maleimide compound other than the compound (M) represented by the formula (M) and the compound (M1) represented by the formula (M1) is 50 parts by mass or less, the metal foil peeling of the obtained cured product will be improved. Strength and low water absorption tendency. The resin composition in this embodiment may contain only one type of maleimide compound other than the compound (M) represented by the formula (M) and the compound (M1) represented by the formula (M1), or may contain two or more types. When two or more types are contained, the total amount is preferably within the above range. Moreover, the resin composition in this embodiment may have a structure which does not substantially contain the maleimide compound other than the compound (M) represented by formula (M) and the compound (M1) represented by formula (M1). Substantially free of maleimide compounds other than the compound (M) represented by the formula (M) and the compound (M1) represented by the formula (M1), relative to 100 parts by mass of the resin solid content in the resin composition. Less than 1 part by mass, preferably less than 0.1 part by mass, more preferably less than 0.01 part by mass.
<<環氧化合物>> 本實施形態之樹脂組成物也可含有環氧化合物。 環氧化合物若為1分子中具有1個以上(宜為2~12,為2~6更佳,為2~4再更佳,為2或3又更佳,為2再更佳)之環氧基的化合物或樹脂,則無特別限制,可廣泛使用印刷配線板之領域中常用的化合物。 環氧化合物可列舉例如:雙酚A型環氧樹脂、雙酚E型環氧樹脂、雙酚F型環氧樹脂、雙酚S型環氧樹脂、苯酚酚醛清漆型環氧樹脂、雙酚A酚醛清漆型環氧樹脂、環氧丙基酯型環氧樹脂、芳烷基酚醛清漆型環氧樹脂、聯苯芳烷基型環氧樹脂、伸萘基醚型環氧樹脂、甲酚酚醛清漆型環氧樹脂、多官能苯酚型環氧樹脂、萘型環氧樹脂、蒽型環氧樹脂、萘骨架改性酚醛清漆型環氧樹脂、苯酚芳烷基型環氧樹脂、萘酚芳烷基型環氧樹脂、雙環戊二烯型環氧樹脂、聯苯型環氧樹脂、脂環族環氧樹脂、多元醇型環氧樹脂、含磷之環氧樹脂、環氧丙基胺、環氧丙基酯、將丁二烯等之雙鍵予以環氧化而成的化合物、利用含羥基之聚矽氧樹脂類與環氧氯丙烷之反應而得的化合物等。藉由使用它們,會改善樹脂組成物之成形性、密合性。它們之中,考慮使阻燃性及耐熱性更進一步改善之觀點,宜為聯苯芳烷基型環氧樹脂、伸萘基醚型環氧樹脂、多官能苯酚型環氧樹脂、萘型環氧樹脂,為聯苯芳烷基型環氧樹脂更佳。 <<Epoxy compounds>> The resin composition of this embodiment may contain an epoxy compound. If the epoxy compound has one or more rings per molecule (preferably 2 to 12, more preferably 2 to 6, more preferably 2 to 4, more preferably 2 or 3, more preferably 2), The oxygen-based compound or resin is not particularly limited, and compounds commonly used in the field of printed wiring boards can be widely used. Examples of the epoxy compound include: bisphenol A type epoxy resin, bisphenol E type epoxy resin, bisphenol F type epoxy resin, bisphenol S type epoxy resin, phenol novolak type epoxy resin, bisphenol A Novolak type epoxy resin, glycidyl ester type epoxy resin, aralkyl novolak type epoxy resin, biphenyl aralkyl type epoxy resin, naphthyl ether type epoxy resin, cresol novolac type type epoxy resin, multifunctional phenol type epoxy resin, naphthalene type epoxy resin, anthracene type epoxy resin, naphthalene skeleton modified novolak type epoxy resin, phenol aralkyl type epoxy resin, naphthol aralkyl type epoxy resin, dicyclopentadiene epoxy resin, biphenyl epoxy resin, cycloaliphatic epoxy resin, polyol epoxy resin, phosphorus-containing epoxy resin, epoxypropylamine, epoxy Propyl ester, compounds obtained by epoxidizing the double bonds of butadiene, etc., compounds obtained by the reaction of hydroxyl-containing silicone resins and epichlorohydrin, etc. By using them, the formability and adhesion of the resin composition will be improved. Among them, from the viewpoint of further improving flame retardancy and heat resistance, biphenyl aralkyl type epoxy resin, naphthylene ether type epoxy resin, multifunctional phenol type epoxy resin, naphthalene type epoxy resin, and naphthalene type epoxy resin are suitable. Oxygen resin, preferably biphenyl aralkyl epoxy resin.
本實施形態之樹脂組成物宜在不損及本發明之效果的範圍內含有環氧化合物。本實施形態之樹脂組成物含有環氧化合物時,其含量相對於樹脂組成物中之樹脂固體成分100質量份,宜為0.1質量份以上,為1質量份以上更佳,為2質量份以上再更佳。環氧化合物的含量藉由為0.1質量份以上,會有改善得到的硬化物之金屬箔剝離強度及韌性的傾向。環氧化合物的含量之上限值,在本實施形態之樹脂組成物含有環氧化合物時,相對於樹脂組成物中之樹脂固體成分100質量份,宜為50質量份以下,為30質量份以下更佳,為20質量份以下再更佳,為10質量份以下又更佳,也可為8質量份以下、5質量份以下。環氧化合物的含量藉由為50質量份以下,會有改善得到的硬化物之電特性的傾向。 本實施形態中的樹脂組成物可僅含1種環氧化合物,也可含有2種以上。含有2種以上時,合計量宜為上述範圍。 又,本實施形態中的樹脂組成物也可設為實質上不含環氧化合物之構成。實質上不含係指環氧化合物的含量相對於樹脂組成物中之樹脂固體成分100質量份為未達0.1質量份,宜為未達0.01質量份,此外也可為未達0.001質量份。 The resin composition of this embodiment preferably contains an epoxy compound within a range that does not impair the effects of the present invention. When the resin composition of this embodiment contains an epoxy compound, its content is preferably 0.1 part by mass or more, more preferably 1 part by mass or more, and more preferably 2 parts by mass or more based on 100 parts by mass of the resin solid content in the resin composition. Better. When the content of the epoxy compound is 0.1 parts by mass or more, the metal foil peeling strength and toughness of the obtained hardened material tend to be improved. When the resin composition of the present embodiment contains an epoxy compound, the upper limit of the content of the epoxy compound is preferably 50 parts by mass or less and 30 parts by mass or less based on 100 parts by mass of the resin solid content in the resin composition. More preferably, it is 20 parts by mass or less, still more preferably 10 parts by mass or less, and it may be 8 parts by mass or less, or 5 parts by mass or less. When the content of the epoxy compound is 50 parts by mass or less, the electrical characteristics of the obtained cured product tend to be improved. The resin composition in this embodiment may contain only one type of epoxy compound, or may contain two or more types. When two or more types are contained, the total amount is preferably within the above range. Moreover, the resin composition in this embodiment may have a structure which does not substantially contain an epoxy compound. Substantially free means that the content of the epoxy compound is less than 0.1 parts by mass, preferably less than 0.01 parts by mass, and may be less than 0.001 parts by mass relative to 100 parts by mass of the resin solid content in the resin composition.
<<酚化合物>> 本實施形態之樹脂組成物也可含有酚化合物。 酚化合物若為1分子中具有1個以上(宜為2~12,為2~6更佳,為2~4再更佳,為2或3又更佳,為2再更佳)之酚性羥基的酚化合物,則無特別限制,可廣泛使用印刷配線板之領域中常用的化合物。 酚化合物可列舉例如:雙酚A型酚醛樹脂、雙酚E型酚醛樹脂、雙酚F型酚醛樹脂、雙酚S型酚醛樹脂、苯酚酚醛清漆樹脂、雙酚A酚醛清漆型酚醛樹脂、環氧丙基酯型酚醛樹脂、芳烷基酚醛清漆酚醛樹脂、聯苯芳烷基型酚醛樹脂、甲酚酚醛清漆型酚醛樹脂、多官能酚醛樹脂、萘酚樹脂、萘酚酚醛清漆樹脂、多官能萘酚樹脂、蒽型酚醛樹脂、萘骨架改性酚醛清漆型酚醛樹脂、苯酚芳烷基型酚醛樹脂、萘酚芳烷基型酚醛樹脂、雙環戊二烯型酚醛樹脂、聯苯型酚醛樹脂、脂環族酚醛樹脂、多元醇型酚醛樹脂、含磷之酚醛樹脂、含羥基之聚矽氧樹脂類等。它們之中,考慮使得到的硬化物之耐燃性更進一步改善之觀點,宜為選自由聯苯芳烷基型酚醛樹脂、萘酚芳烷基型酚醛樹脂、含磷之酚醛樹脂、及含羥基之聚矽氧樹脂構成之群組中之至少1種。 <<Phenolic compounds>> The resin composition of this embodiment may contain a phenol compound. If the phenolic compound has 1 or more (preferably 2 to 12, more preferably 2 to 6, more preferably 2 to 4, more preferably 2 or 3, more preferably 2) phenolic properties per molecule The hydroxyl phenolic compound is not particularly limited, and compounds commonly used in the field of printed wiring boards can be widely used. Examples of the phenolic compound include bisphenol A phenolic resin, bisphenol E phenolic resin, bisphenol F phenolic resin, bisphenol S phenolic resin, phenol novolak resin, bisphenol A novolak type phenolic resin, and epoxy. Propyl ester type phenolic resin, aralkyl novolac phenolic resin, biphenyl aralkyl type phenolic resin, cresol novolak type phenolic resin, multifunctional phenolic resin, naphthol resin, naphthol novolak resin, multifunctional naphthalene Phenolic resin, anthracene type phenolic resin, naphthalene skeleton modified novolac type phenolic resin, phenol aralkyl type phenolic resin, naphthol aralkyl type phenolic resin, dicyclopentadiene type phenolic resin, biphenyl type phenolic resin, lipid Cyclic phenolic resin, polyol-type phenolic resin, phosphorus-containing phenolic resin, hydroxyl-containing polysiloxane resin, etc. Among them, from the viewpoint of further improving the flame resistance of the obtained hardened material, it is preferable to select one selected from the group consisting of biphenyl aralkyl type phenolic resin, naphthol aralkyl type phenolic resin, phosphorus-containing phenolic resin, and hydroxyl-containing phenolic resin. At least one of the group consisting of polysiloxane resins.
本實施形態之樹脂組成物宜在不損及本發明之效果的範圍內含有酚化合物。本實施形態之樹脂組成物含有酚化合物時,其含量相對於樹脂組成物中之樹脂固體成分100質量份,宜為0.1質量份以上,為1質量份以上更佳,為2質量份以上再更佳。又,宜為50質量份以下,為30質量份以下更佳,為20質量份以下再更佳,為10質量份以下又更佳,也可為5質量份以下。 本實施形態中的樹脂組成物可僅含1種酚化合物,也可含有2種以上。含有2種以上時,合計量宜為上述範圍。 又,本實施形態中的樹脂組成物中,也可設為實質上不含酚化合物之構成。實質上不含係指酚化合物的含量相對於樹脂組成物中之樹脂固體成分100質量份為未達0.1質量份。 The resin composition of this embodiment preferably contains a phenolic compound within a range that does not impair the effects of the present invention. When the resin composition of this embodiment contains a phenolic compound, its content is preferably 0.1 part by mass or more, more preferably 1 part by mass or more, and more preferably 2 parts by mass or more based on 100 parts by mass of the resin solid content in the resin composition. good. Moreover, it is preferably 50 parts by mass or less, more preferably 30 parts by mass or less, more preferably 20 parts by mass or less, more preferably 10 parts by mass or less, and may be 5 parts by mass or less. The resin composition in this embodiment may contain only one type of phenolic compound, or may contain two or more types. When two or more types are contained, the total amount is preferably within the above range. Furthermore, the resin composition in this embodiment may be configured to contain substantially no phenol compound. Substantially free means that the content of the phenolic compound is less than 0.1 parts by mass relative to 100 parts by mass of the resin solid content in the resin composition.
<<氧雜環丁烷樹脂>> 本實施形態之樹脂組成物也可含有氧雜環丁烷樹脂。 氧雜環丁烷樹脂若為具有1個以上(宜為2~12,為2~6更佳,為2~4再更佳,為2或3又更佳,為2再更佳)之氧雜環丁烷基的化合物,則無特別限制,可廣泛使用印刷配線板之領域中常用的化合物。 氧雜環丁烷樹脂可列舉例如:氧雜環丁烷、烷基氧雜環丁烷(例如2-甲基氧雜環丁烷、2,2-二甲基氧雜環丁烷、3-甲基氧雜環丁烷、3,3-二甲基氧雜環丁烷等)、3-甲基-3-甲氧基甲基氧雜環丁烷、3,3-二(三氟甲基)氧雜環丁烷、2-氯甲基氧雜環丁烷、3,3-雙(氯甲基)氧雜環丁烷、聯苯型氧雜環丁烷、OXT-101(東亞合成公司製)、OXT-121(東亞合成公司製)等。 <<Oxetane resin>> The resin composition of this embodiment may contain an oxetane resin. If the oxetane resin has more than 1 (preferably 2 to 12, more preferably 2 to 6, more preferably 2 to 4, more preferably 2 or 3, more preferably 2) oxygen The heterocyclobutyl compound is not particularly limited, and compounds commonly used in the field of printed wiring boards can be widely used. Examples of the oxetane resin include: oxetane, alkyloxetane (for example, 2-methyloxetane, 2,2-dimethyloxetane, 3- Methyl oxetane, 3,3-dimethyloxetane, etc.), 3-methyl-3-methoxymethyloxetane, 3,3-bis(trifluoromethyl base) oxetane, 2-chloromethyl oxetane, 3,3-bis(chloromethyl) oxetane, biphenyl oxetane, OXT-101 (East Asia Synthetic Co., Ltd.), OXT-121 (manufactured by Toa Gosei Co., Ltd.), etc.
本實施形態之樹脂組成物宜在不損及本發明之效果的範圍內含有氧雜環丁烷樹脂。本實施形態之樹脂組成物含有氧雜環丁烷樹脂時,其含量相對於樹脂組成物中之樹脂固體成分100質量份,宜為0.1質量份以上,為1質量份以上更佳,為2質量份以上再更佳。氧雜環丁烷樹脂的含量藉由為0.1質量份以上,會有改善得到的硬化物之金屬箔剝離強度及韌性的傾向。氧雜環丁烷樹脂的含量之上限值,在本實施形態之樹脂組成物含有氧雜環丁烷樹脂時,相對於樹脂組成物中之樹脂固體成分100質量份,宜為50質量份以下,為30質量份以下更佳,為20質量份以下再更佳,為10質量份以下又更佳,也可為5質量份以下。氧雜環丁烷樹脂的含量藉由為50質量份以下,會有改善得到的硬化物之電特性的傾向。 本實施形態中的樹脂組成物可僅含1種氧雜環丁烷樹脂,也可含有2種以上。含有2種以上時,合計量宜為上述範圍。 又,本實施形態中的樹脂組成物也可設為實質上不含氧雜環丁烷樹脂之構成。實質上不含係指氧雜環丁烷樹脂的含量相對於樹脂組成物中之樹脂固體成分100質量份為未達0.1質量份。 The resin composition of this embodiment preferably contains an oxetane resin within a range that does not impair the effects of the present invention. When the resin composition of this embodiment contains an oxetane resin, its content is preferably 0.1 part by mass or more, more preferably 1 part by mass or more, and 2 parts by mass relative to 100 parts by mass of the resin solid content in the resin composition. More than one portion is better. When the content of the oxetane resin is 0.1 parts by mass or more, the metal foil peeling strength and toughness of the obtained cured product tend to be improved. The upper limit of the content of the oxetane resin is preferably 50 parts by mass or less based on 100 parts by mass of the resin solid content in the resin composition when the resin composition of the present embodiment contains the oxetane resin. , it is more preferably 30 parts by mass or less, more preferably 20 parts by mass or less, more preferably 10 parts by mass or less, and it may be 5 parts by mass or less. When the content of the oxetane resin is 50 parts by mass or less, the electrical characteristics of the obtained cured product tend to be improved. The resin composition in this embodiment may contain only one type of oxetane resin, or may contain two or more types. When two or more types are contained, the total amount is preferably within the above range. Furthermore, the resin composition in this embodiment may be substantially free of oxetane resin. Substantially free means that the content of the oxetane resin is less than 0.1 parts by mass relative to 100 parts by mass of the resin solid content in the resin composition.
<<苯并㗁𠯤化合物>> 本實施形態之樹脂組成物也可含有苯并㗁𠯤化合物。 苯并㗁𠯤化合物若為1分子中具有2個以上(宜為2~12,為2~6更佳,為2~4再更佳,為2或3又更佳,為2再更佳)之二氫苯并㗁𠯤環的化合物,則無特別限制,可廣泛使用印刷配線板之領域中常用的化合物。 苯并㗁𠯤化合物可列舉例如:雙酚A型苯并㗁𠯤BA-BXZ(小西化學公司製)、雙酚F型苯并㗁𠯤BF-BXZ(小西化學公司製)、雙酚S型苯并㗁𠯤BS-BXZ(小西化學公司製)等。 <<Benzodiazepine compounds>> The resin composition of this embodiment may contain a benzene compound. If the benzene compound has 2 or more in 1 molecule (preferably 2 to 12, more preferably 2 to 6, more preferably 2 to 4, more preferably 2 or 3, more preferably 2) The compound of the dihydrobenzoic acid ring is not particularly limited, and compounds commonly used in the field of printed wiring boards can be widely used. Examples of benzophenone compounds include: bisphenol A type benzoyl BA-BXZ (manufactured by Konishi Chemical Co., Ltd.), bisphenol F type benzophenone BF-BXZ (manufactured by Konishi Chemical Co., Ltd.), bisphenol S type benzene Also available are BS-BXZ (manufactured by Konishi Chemical Co., Ltd.), etc.
本實施形態之樹脂組成物宜在不損及本發明之效果的範圍內含有苯并㗁𠯤化合物。本實施形態之樹脂組成物含有苯并㗁𠯤化合物時,其含量相對於樹脂組成物中之樹脂固體成分100質量份,宜為0.1質量份以上,為50質量份以下更佳。 本實施形態中的樹脂組成物中,可僅含1種苯并㗁𠯤化合物,也可含有2種以上。含有2種以上時,合計量宜為上述範圍。 又,本實施形態中的樹脂組成物中,也可設為實質上不含苯并㗁𠯤化合物之構成。實質上不含係指苯并㗁𠯤化合物的含量相對於樹脂組成物中之樹脂固體成分100質量份為未達0.1質量份。 The resin composition of this embodiment preferably contains a benzene compound within a range that does not impair the effects of the present invention. When the resin composition of this embodiment contains a benzene compound, its content is preferably 0.1 parts by mass or more and more preferably 50 parts by mass or less based on 100 parts by mass of the resin solid content in the resin composition. The resin composition in this embodiment may contain only one type of benzodiazepine compound, or may contain two or more types. When two or more types are contained, the total amount is preferably within the above range. Moreover, the resin composition in this embodiment may be substantially free of benzene compounds. Substantially free means that the content of the benzophenone compound is less than 0.1 parts by mass relative to 100 parts by mass of the resin solid content in the resin composition.
<<含有(甲基)烯丙基之化合物>> 本實施形態之樹脂組成物宜含有含(甲基)烯丙基之化合物,含有含烯丙基之化合物更佳。 又,含有(甲基)烯丙基之化合物宜為含有2個以上之(甲基)烯丙基的化合物,為含有2個以上之烯丙基的化合物更佳。 含有(甲基)烯丙基之化合物宜包含選自由烯丙基異氰尿酸酯化合物、烯丙基取代納迪克醯亞胺化合物、具有甘脲結構之烯丙基化合物、及二烯丙苯二甲酸酯構成之群組中之至少1種,包含選自由烯丙基異氰尿酸酯化合物、烯丙基取代納迪克醯亞胺化合物、及具有甘脲結構之烯丙基化合物構成之群組中之至少1種更佳,包含烯丙基取代納迪克醯亞胺化合物再更佳,為烯基納迪克醯亞胺化合物又更佳。 <<Compounds containing (meth)allyl>> The resin composition of this embodiment preferably contains a (meth)allyl-containing compound, and more preferably contains an allyl-containing compound. Furthermore, the compound containing a (meth)allyl group is preferably a compound containing two or more (meth)allyl groups, and a compound containing two or more allyl groups is more preferred. The compound containing a (meth)allyl group preferably includes an allyl isocyanurate compound, an allyl-substituted nadicamide compound, an allyl compound having a glycoluril structure, and diallyl benzene. At least one of the group consisting of dicarboxylic acid esters, including an allyl isocyanurate compound, an allyl-substituted nadicamide compound, and an allyl compound having a glycoluril structure. More preferably, it is at least one of the group, more preferably it contains an allyl-substituted nadicide imine compound, and still more preferably it is an alkenyl nadicide imine compound.
本實施形態之樹脂組成物含有含(甲基)烯丙基之化合物時,其分子量宜為195以上,為300以上更佳,為400以上再更佳,為500以上又更佳。藉由設為前述下限值以上,會有更為改善得到的硬化物之低介電性及耐熱性的傾向。含有(甲基)烯丙基之化合物之分子量也宜為3000以下,為2000以下更佳,為1000以下再更佳,為800以下又更佳。藉由設為前述上限值以下,會有更為改善得到的硬化物之低熱膨脹性的傾向。When the resin composition of this embodiment contains a (meth)allyl group-containing compound, its molecular weight is preferably 195 or more, more preferably 300 or more, more preferably 400 or more, still more preferably 500 or more. By setting it to the lower limit value or more, the low dielectric property and heat resistance of the obtained hardened material tend to be further improved. The molecular weight of the (meth)allyl-containing compound is also preferably 3,000 or less, more preferably 2,000 or less, still more preferably 1,000 or less, still more preferably 800 or less. By setting it below the above-mentioned upper limit, the low thermal expansion property of the obtained hardened material tends to be further improved.
本實施形態之樹脂組成物含有含(甲基)烯丙基之化合物時,其含量相對於樹脂組成物中之樹脂固體成分100質量份,宜為1質量份以上,為3質量份以上更佳,為5質量份以上再更佳,也可為10質量份以上。藉由將含有(甲基)烯丙基之化合物的含量設為上述下限值以上,會有樹脂組成物之成形性優良,且更為改善得到的硬化物之耐熱性的傾向。又,含有(甲基)烯丙基之化合物的含量之上限值相對於樹脂組成物中之樹脂固體成分100質量份,宜為40質量份以下,為30質量份以下更佳,為20質量份以下再更佳。藉由將含有(甲基)烯丙基之化合物的含量設為上述上限值以下,會有更為改善得到的硬化物之低熱膨脹性的傾向。 本實施形態之樹脂組成物可僅含1種含有(甲基)烯丙基之化合物,也可含有2種以上。含有2種以上時,合計量宜為上述範圍。 又,本實施形態中的樹脂組成物也可設為實質上不含含有(甲基)烯丙基之化合物之構成。實質上不含係指含有(甲基)烯丙基之化合物的含量相對於樹脂組成物中之樹脂固體成分100質量份為未達0.1質量份。 When the resin composition of this embodiment contains a (meth)allyl group-containing compound, its content is preferably 1 part by mass or more, more preferably 3 parts by mass or more, based on 100 parts by mass of the resin solid content in the resin composition. , more preferably 5 parts by mass or more, and may be 10 parts by mass or more. By setting the content of the (meth)allyl group-containing compound to be equal to or more than the above lower limit, the moldability of the resin composition will be excellent, and the heat resistance of the resulting cured product will tend to be further improved. In addition, the upper limit of the content of the (meth)allyl group-containing compound is preferably 40 parts by mass or less, more preferably 30 parts by mass or less, and 20 parts by mass relative to 100 parts by mass of the resin solid content in the resin composition. A portion or less is better. By setting the content of the (meth)allyl group-containing compound below the above upper limit, the low thermal expansion property of the obtained cured product tends to be further improved. The resin composition of this embodiment may contain only one type of (meth)allyl-containing compound, or may contain two or more types. When two or more types are contained, the total amount is preferably within the above range. Moreover, the resin composition in this embodiment may have a structure which does not substantially contain the compound containing a (meth)allyl group. Substantially free means that the content of the (meth)allyl-containing compound is less than 0.1 parts by mass relative to 100 parts by mass of the resin solid content in the resin composition.
<<<烯丙基異氰尿酸酯化合物>>> 烯丙基異氰尿酸酯化合物只要為具有2個以上之烯丙基且具有異氰尿酸酯環(尿酸酯骨架)的化合物,則無特別限制,宜為式(TA)表示之化合物。 式(TA) [化34] 式(TA)中,R A表示取代基。 <<<Allyl isocyanurate compound>>> The allyl isocyanurate compound must be a compound having two or more allyl groups and an isocyanurate ring (uric acid ester skeleton) , then there is no particular restriction, and it is preferably a compound represented by formula (TA). Formula (TA) [Chemical 34] In formula (TA), R A represents a substituent.
式(TA)中,R A表示取代基,為化學式量15~500之取代基更佳。 In the formula (TA), R A represents a substituent, preferably a substituent with a chemical formula weight of 15 to 500.
R A之第一例為碳數1~22之烷基、或碳數2~22之烯基。藉由使用具有碳數1~22之烷基、或碳數2~22之烯基的烯丙基化合物,可提供能獲得交聯性優良且具有高韌性之硬化物的樹脂組成物。藉此,即使樹脂組成物中不含玻璃布等基材時,仍可在蝕刻處理等時抑制破損等。 前述烷基及/或烯基的碳數,考慮操作性改善之觀點,宜為3以上,為8以上更佳,也可為12以上,且宜為18以下。據認為藉此樹脂組成物之樹脂流動性會變良好,且可使使用本實施形態之樹脂組成物製作多層電路基板等時的電路填埋性等更優良。 The first example of RA is an alkyl group having 1 to 22 carbon atoms or an alkenyl group having 2 to 22 carbon atoms. By using an allyl compound having an alkyl group having 1 to 22 carbon atoms or an alkenyl group having 2 to 22 carbon atoms, it is possible to provide a resin composition capable of obtaining a cured product having excellent crosslinkability and high toughness. Thereby, even if the resin composition does not contain a base material such as glass cloth, damage during etching processing, etc. can be suppressed. The number of carbon atoms in the alkyl group and/or alkenyl group is preferably 3 or more, more preferably 8 or more, and may be 12 or more and preferably 18 or less from the viewpoint of improving operability. It is thought that the resin fluidity of the resin composition will be improved by this, and the circuit embedding property when using the resin composition of this embodiment to produce a multilayer circuit board or the like can be improved.
R A之第二例為含有烯丙基異氰尿酸酯基的基。R A含有烯丙基異氰尿酸酯基時,式(TA)表示之化合物宜為式(TA-1)表示之化合物。 式(TA-1) [化35] 式(TA-1)中,R A2為2價連結基。 The second example of R A is a group containing an allyl isocyanurate group. When R A contains an allyl isocyanurate group, the compound represented by formula (TA) is preferably a compound represented by formula (TA-1). Formula (TA-1) [Chemical 35] In formula (TA-1), R A2 is a divalent linking group.
式(TA-1)中,R A2宜為化學式量為54~250之2價連結基,為化學式量為54~250且兩末端為碳原子之2價連結基更佳,為碳數2~20之脂肪族烴基再更佳(惟,脂肪族烴基中也可含有醚基,又,也可含有羥基)。更具體而言,R A2宜為下式(i)~(iii)中任一者表示之基。 [化36] 式中(i)~(iii)中,p c1表示亞甲基之重複單元數,且為2~18之整數。p c2表示氧伸乙基之重複單元數,且為0或1。*為鍵結部位。 前述p c1宜為2~10之整數,為3~8之整數更佳,為3~5之整數再更佳。 前述p c2也可為0,亦可為1,宜為1。 In the formula (TA-1), R A2 is preferably a divalent linking group with a chemical formula weight of 54 to 250, more preferably a divalent linking group with a chemical formula weight of 54 to 250 and carbon atoms at both ends, and a carbon number of 2 to 250. The aliphatic hydrocarbon group of 20 is even better (however, the aliphatic hydrocarbon group may also contain an ether group and may also contain a hydroxyl group). More specifically, R A2 is preferably a group represented by any one of the following formulas (i) to (iii). [Chemical 36] In the formulas (i) to (iii), p c1 represents the number of repeating units of the methylene group, and is an integer from 2 to 18. p c2 represents the number of repeating units of oxyethylene group, and is 0 or 1. * is the bonding part. The aforementioned p c1 is preferably an integer from 2 to 10, more preferably an integer from 3 to 8, and even more preferably an integer from 3 to 5. The aforementioned p c2 may also be 0 or 1, preferably 1.
R A2宜為第一例。 R A2 should be the first example.
本實施形態中,式(TA)表示之化合物的反應基(烯丙基)當量宜為1000以下。據認為前述當量若為1000以下,則可更確實地獲得高Tg。 前述碳數1~22之烷基可列舉直鏈狀或支鏈狀之烷基,可列舉例如:甲基、乙基、丙基、丁基、戊基、己基、庚基、辛基、壬基、癸基、十二烷基、十四烷基、十六烷基、十八烷基、二十烷基、二十二烷基等。又,前述碳數2~22之烯基可列舉例如:烯丙基、癸烯基等。 In this embodiment, the reactive group (allyl) equivalent of the compound represented by formula (TA) is preferably 1,000 or less. It is considered that if the equivalent is 1,000 or less, high Tg can be obtained more reliably. The alkyl group having 1 to 22 carbon atoms can be a linear or branched alkyl group, and examples thereof include methyl, ethyl, propyl, butyl, pentyl, hexyl, heptyl, octyl, and nonyl. Base, decyl, dodecyl, tetradecyl, hexadecyl, octadecyl, eicosyl, behenyl, etc. Examples of the alkenyl group having 2 to 22 carbon atoms include allyl group, decene group, and the like.
式(TA)表示之化合物之具體例可列舉例如:三烯丙基異氰尿酸酯、5-辛基-1,3-二烯丙基異氰尿酸酯、5-十二烷基-1,3-二烯丙基異氰尿酸酯、5-十四烷基-1,3-二烯丙基異氰尿酸酯、5-十六烷基-1,3-二烯丙基異氰尿酸酯、5-十八烷基-1,3-二烯丙基異氰尿酸酯、5-二十烷基-1,3-二烯丙基異氰尿酸酯、5-二十二烷基-1,3-二烯丙基異氰尿酸酯、5-癸烯基-1,3-二烯丙基異氰尿酸酯等。它們可使用1種或也可組合使用2種以上,亦能以預聚物形式使用。Specific examples of the compound represented by formula (TA) include triallyl isocyanurate, 5-octyl-1,3-diallyl isocyanurate, and 5-dodecyl- 1,3-diallylisocyanurate, 5-tetradecyl-1,3-diallylisocyanurate, 5-hexadecyl-1,3-diallyl Isocyanurate, 5-octadecyl-1,3-diallylisocyanurate, 5-eicosyl-1,3-diallylisocyanurate, 5- Behenyl-1,3-diallyl isocyanurate, 5-decenyl-1,3-diallyl isocyanurate, etc. These may be used alone or in combination of two or more types, and may be used in the form of a prepolymer.
式(TA)表示之化合物之製造方法並無特別限定,例如可藉由將二烯丙基異氰尿酸酯與烷基鹵化物,在N,N’-二甲基甲醯胺等非質子性極性溶劑中,於氫氧化鈉、碳酸鉀、三乙胺等鹼性物質的存在下,以約60℃~150℃之溫度進行反應來獲得。The method of producing the compound represented by the formula (TA) is not particularly limited. For example, diallylisocyanurate and an alkyl halide can be produced in an aprotic compound such as N,N'-dimethylformamide. It is obtained by reacting in a polar solvent at a temperature of about 60°C to 150°C in the presence of alkaline substances such as sodium hydroxide, potassium carbonate, and triethylamine.
又,式(TA)表示之化合物也可使用市售者。市售者並無特別限制,可列舉例如四國化成工業(股)製L-DAIC。三烯丙基異氰尿酸酯可列舉例如三菱化學(股)製TAIC。式(TA-1)表示之化合物可列舉例如四國化成工業(股)製DD-1。In addition, a commercially available compound represented by formula (TA) can also be used. There are no particular restrictions on commercial sellers, and examples thereof include L-DAIC manufactured by Shikoku Chemical Industry Co., Ltd. Examples of triallyl isocyanurate include TAIC manufactured by Mitsubishi Chemical Co., Ltd. Examples of the compound represented by the formula (TA-1) include DD-1 manufactured by Shikoku Chemical Industry Co., Ltd.
烯丙基異氰尿酸酯化合物(宜為式(TA)表示之化合物)之分子量宜為200以上,為300以上更佳,為400以上再更佳,為500以上又更佳。藉由將前述分子量設為上述下限值以上,會有更為改善得到的硬化物之低介電性及耐熱性的傾向。又,烯丙基異氰尿酸酯化合物(宜為式(TA)表示之化合物)之分子量宜為3000以下,為2000以下更佳,為1000以下再更佳,為800以下又更佳。藉由將前述分子量設為上述上限值以下,會有更為改善得到的硬化物之低熱膨脹性的傾向。The molecular weight of the allyl isocyanurate compound (preferably the compound represented by formula (TA)) is preferably 200 or more, more preferably 300 or more, more preferably 400 or more, still more preferably 500 or more. By setting the molecular weight to be equal to or higher than the lower limit, the low dielectric properties and heat resistance of the obtained cured product tend to be further improved. Furthermore, the molecular weight of the allyl isocyanurate compound (preferably the compound represented by formula (TA)) is preferably 3,000 or less, more preferably 2,000 or less, still more preferably 1,000 or less, still more preferably 800 or less. By setting the molecular weight to be equal to or less than the upper limit, the low thermal expansion property of the obtained cured product tends to be further improved.
本實施形態之樹脂組成物含有烯丙基異氰尿酸酯化合物時,其含量相對於樹脂組成物中之樹脂固體成分100質量份,宜為1質量份以上,為3質量份以上更佳,為5質量份以上再更佳,也可為10質量份以上。藉由將烯丙基異氰尿酸酯化合物的含量設為上述下限值以上,會有樹脂組成物之成形性優良,且更為改善得到的硬化物之耐熱性的傾向。又,烯丙基異氰尿酸酯化合物的含量之上限值相對於樹脂組成物中之樹脂固體成分100質量份,宜為40質量份以下,為30質量份以下更佳,為20質量份以下再更佳。藉由將烯丙基異氰尿酸酯化合物的含量設為上述上限值以下,會有更為改善得到的硬化物之低熱膨脹性的傾向。 本實施形態之樹脂組成物中,可僅含1種烯丙基異氰尿酸酯,也可含有2種以上。含有2種以上時,合計量宜為上述範圍。 When the resin composition of this embodiment contains an allyl isocyanurate compound, its content is preferably 1 part by mass or more, more preferably 3 parts by mass or more, based on 100 parts by mass of the resin solid content in the resin composition. More preferably, it is 5 parts by mass or more, and it may be 10 parts by mass or more. By setting the content of the allyl isocyanurate compound to not less than the above lower limit, the moldability of the resin composition is excellent, and the heat resistance of the obtained cured product tends to be further improved. In addition, the upper limit of the content of the allyl isocyanurate compound is preferably 40 parts by mass or less, more preferably 30 parts by mass or less, and 20 parts by mass relative to 100 parts by mass of the resin solid content in the resin composition. The following is even better. By setting the content of the allyl isocyanurate compound below the above upper limit, the low thermal expansion property of the obtained cured product tends to be further improved. The resin composition of this embodiment may contain only one type of allyl isocyanurate, or may contain two or more types. When two or more types are contained, the total amount is preferably within the above range.
<<<烯丙基取代納迪克醯亞胺化合物>>> 烯丙基取代納迪克醯亞胺化合物若為分子中具有1個以上之烯丙基取代納迪克醯亞胺基的化合物(宜為分子中具有1個以上之被烯基取代之納迪克醯亞胺基的化合物(烯基納迪克醯亞胺化合物)),則無特別限制。其具體例可列舉下式(AN)表示之化合物。 式(AN) [化38] 式(AN)中,R 1分別獨立地表示氫原子、或碳數1~6之烷基,R 2表示碳數1~6之伸烷基、伸苯基、伸聯苯基、伸萘基、或式(AN-2)或(AN-3)表示之基。 式(AN-2) [化40] 式(AN-2)中,R 3表示亞甲基、亞異丙基、-C(=O)-、-O-、-S-、或-S(=O) 2-表示之基。 式(AN-3) [化42] 式(AN-3)中,R 4分別獨立地表示碳數1~4之伸烷基、或碳數5~8之伸環烷基。 <<<Allyl-substituted nadicide imine compound>> If the allyl-substituted nadicide imine compound is a compound with more than one allyl-substituted nadicide imine group in the molecule (preferably There are no particular restrictions on compounds having one or more nadicidoimine groups substituted by alkenyl groups in the molecule (alkenyl nadicidoimine compounds). Specific examples thereof include compounds represented by the following formula (AN). Formula (AN) [Chemistry 38] In the formula (AN), R 1 each independently represents a hydrogen atom or an alkyl group having 1 to 6 carbon atoms, and R 2 represents an alkylene group, phenylene group, biphenylene group, or naphthylene group having 1 to 6 carbon atoms. , or the base represented by formula (AN-2) or (AN-3). Formula (AN-2) [Chemical 40] In the formula (AN-2), R 3 represents a methylene group, an isopropylene group, a group represented by -C(=O)-, -O-, -S-, or -S(=O) 2 -. Formula (AN-3) [Chemical 42] In formula (AN-3), R 4 each independently represents an alkylene group having 1 to 4 carbon atoms or a cycloalkylene group having 5 to 8 carbon atoms.
又,式(AN)表示之化合物也可使用市售者。市售者並無特別限制,可列舉例如:式(AN-4)表示之化合物(BANI-M(丸善石油化學(股)製))、式(AN-5)表示之化合物(BANI-X(丸善石油化學(股)製))等。它們可使用1種或組合使用2種以上。 式(AN-4) [化55] 式(AN-5) [化56] In addition, a commercially available compound represented by formula (AN) can also be used. Commercially available compounds are not particularly limited, and examples include compounds represented by formula (AN-4) (BANI-M (manufactured by Maruzen Petrochemical Co., Ltd.)), compounds represented by formula (AN-5) (BANI-X ( Maruzen Petrochemical Co., Ltd.), etc. These can be used 1 type or in combination of 2 or more types. Formula (AN-4) [Chemistry 55] Formula (AN-5) [Chemistry 56]
烯丙基取代納迪克醯亞胺化合物(宜為式(AN)表示之化合物)之分子量宜為400以上,為500以上更佳,也可為550以上。藉由將烯丙基取代納迪克醯亞胺化合物之分子量設為上述下限值以上,會有更為改善得到的硬化物之低介電性、低熱膨脹性、及耐熱性的傾向。烯丙基取代納迪克醯亞胺化合物(宜為式(AN)表示之化合物)之分子量也宜為1500以下,為1000以下更佳,為800以下再更佳,也可為700以下、600以下。藉由將烯丙基取代納迪克醯亞胺化合物之分子量設為上述上限值以下,會有更為改善樹脂組成物之成形性及得到的硬化物之剝離強度的傾向。The molecular weight of the allyl-substituted nadicamide compound (preferably the compound represented by formula (AN)) is preferably 400 or more, more preferably 500 or more, and may also be 550 or more. By setting the molecular weight of the allyl-substituted nadic acid imine compound to be equal to or higher than the above lower limit, the low dielectric property, low thermal expansion property, and heat resistance of the obtained cured product tend to be further improved. The molecular weight of the allyl-substituted nadicamide compound (preferably a compound represented by formula (AN)) is also preferably 1,500 or less, more preferably 1,000 or less, still more preferably 800 or less, and may also be 700 or less or 600 or less. . By setting the molecular weight of the allyl-substituted nadicide imine compound to less than the above upper limit, the moldability of the resin composition and the peel strength of the obtained cured product tend to be further improved.
本實施形態之樹脂組成物含有烯丙基取代納迪克醯亞胺化合物(宜為式(AN)表示之化合物)時,其含量相對於樹脂組成物中之樹脂固體成分100質量份,宜為0.1質量份以上,為1質量份以上更佳,為2質量份以上再更佳。又,宜為50質量份以下,為30質量份以下更佳,為20質量份以下再更佳,為10質量份以下又更佳,也可為5質量份以下。藉由將烯丙基取代納迪克醯亞胺化合物的含量設為上述上限值以下,會有更為改善樹脂組成物之成形性及得到的硬化物之剝離強度的傾向。 本實施形態之樹脂組成物可僅含1種烯丙基取代納迪克醯亞胺化合物,也可含有2種以上。含有2種以上時,合計量宜為上述範圍。 又,本實施形態中的樹脂組成物也可設為實質上不含烯丙基取代納迪克醯亞胺化合物之構成。實質上不含係指烯丙基取代納迪克醯亞胺化合物的含量相對於樹脂組成物中之樹脂固體成分100質量份為未達0.1質量份。 When the resin composition of this embodiment contains an allyl-substituted nadicamide compound (preferably a compound represented by formula (AN)), its content is preferably 0.1 with respect to 100 parts by mass of the resin solid content in the resin composition. The amount is more than 1 part by mass, more preferably not less than 1 part by mass, and even more preferably not less than 2 parts by mass. Moreover, it is preferably 50 parts by mass or less, more preferably 30 parts by mass or less, more preferably 20 parts by mass or less, more preferably 10 parts by mass or less, and may be 5 parts by mass or less. By setting the content of the allyl-substituted nadicamide compound below the above upper limit, the formability of the resin composition and the peel strength of the obtained cured product tend to be further improved. The resin composition of this embodiment may contain only one type of allyl-substituted nadicamide compound, or may contain two or more types. When two or more types are contained, the total amount is preferably within the above range. Moreover, the resin composition in this embodiment may be a structure which does not substantially contain an allyl-substituted nadic acid imine compound. Substantially free means that the content of the allyl-substituted nadicamide compound is less than 0.1 parts by mass relative to 100 parts by mass of the resin solid content in the resin composition.
<<<具有甘脲結構之烯丙基化合物>>> 具有甘脲結構之烯丙基化合物若為含有2個以上之甘脲結構及烯丙基的化合物,則無特別限定,宜為式(GU)表示之化合物。 式(GU) [化44] 式(GU)中,R分別獨立地為氫原子或取代基,且R中之至少2個為含有烯丙基之基。 式(GU)中,R宜分別獨立地為氫原子、碳數1~5之烷基、或碳數2~5之烯基,為碳數2~5之烯基更佳,為烯丙基再更佳。 式(GU)中,就R而言,宜為有3個或4個R含有烯丙基之基,為有4個R含有烯丙基之基更佳。 <<<Allyl compound having glycoluril structure>>> If the allyl compound having glycoluril structure is a compound containing two or more glycoluril structures and allyl groups, there is no particular limitation, and it is preferably of the formula ( Compounds represented by GU). Formula (GU) [Chemical 44] In formula (GU), R is each independently a hydrogen atom or a substituent, and at least 2 of R are groups containing allyl groups. In the formula (GU), R is preferably a hydrogen atom, an alkyl group with 1 to 5 carbon atoms, or an alkenyl group with 2 to 5 carbon atoms, more preferably an alkenyl group with 2 to 5 carbon atoms, and is allyl. Even better. In the formula (GU), R is preferably a group having 3 or 4 R's containing allyl groups, more preferably 4 R's containing allyl groups.
式(GU)表示之化合物之具體例可列舉1,3,4,6-四烯丙基甘脲(式(GU)中,R全部為烯丙基之化合物)。Specific examples of the compound represented by the formula (GU) include 1,3,4,6-tetraallyl glycoluril (a compound in which all R in the formula (GU) are allyl groups).
又,式(GU)表示之化合物也可使用市售者。市售者並無特別限制,可列舉例如四國化成工業公司製TA-G。In addition, a commercially available compound represented by formula (GU) can also be used. Commercially available ones are not particularly limited, and examples thereof include TA-G manufactured by Shikoku Chemical Industry Co., Ltd.
具有甘脲結構之烯丙基化合物(宜為式(GU)表示之化合物)之分子量宜為195以上,為220以上更佳,為250以上再更佳,也可為300以上、400以上。藉由將具有甘脲結構之烯丙基化合物之分子量設為上述下限值以上,會有更為改善得到的硬化物之低介電性及耐熱性的傾向。具有甘脲結構之烯丙基化合物(宜為式(GU)表示之化合物)之分子量也宜為1500以下,為1000以下更佳,為800以下再更佳,也可為700以下、600以下。藉由將具有甘脲結構之烯丙基化合物之分子量設為上述上限值以下,會有更為改善得到的硬化物之低熱膨脹性的傾向。The molecular weight of the allyl compound having a glycoluril structure (preferably a compound represented by formula (GU)) is preferably 195 or more, more preferably 220 or more, more preferably 250 or more, and may also be 300 or more or 400 or more. By setting the molecular weight of the allyl compound having a glycoluril structure to the above lower limit value or more, the low dielectric property and heat resistance of the obtained cured product tend to be further improved. The molecular weight of the allyl compound having a glycoluril structure (preferably a compound represented by formula (GU)) is also preferably 1,500 or less, more preferably 1,000 or less, more preferably 800 or less, and may also be 700 or less or 600 or less. By setting the molecular weight of the allyl compound having a glycoluril structure to the above upper limit or less, the low thermal expansion property of the obtained cured product tends to be further improved.
本實施形態之樹脂組成物含有具有甘脲結構之烯丙基化合物(宜為式(GU)表示之化合物)時,其含量相對於樹脂組成物中之樹脂固體成分100質量份,宜為1質量份以上,為3質量份以上更佳,為5質量份以上再更佳,也可為10質量份以上。藉由將具有甘脲結構之烯丙基化合物的含量設為上述下限值以上,會有更為改善得到的硬化物之低介電性及耐熱性的傾向。又,具有甘脲結構之烯丙基化合物(宜為式(GU)表示之化合物)的含量之上限值相對於樹脂組成物中之樹脂固體成分100質量份,宜為40質量份以下,為30質量份以下更佳,為25質量份以下再更佳,也可為20質量份以下。藉由將具有甘脲結構之烯丙基化合物的含量設為上述上限值以下,會有更為改善得到的硬化物之低熱膨脹性的傾向。 本實施形態之樹脂組成物可僅含1種具有甘脲結構之烯丙基化合物,也可含有2種以上。含有2種以上時,合計量宜為上述範圍。 When the resin composition of this embodiment contains an allyl compound having a glycoluril structure (preferably a compound represented by formula (GU)), its content is preferably 1 part by mass relative to 100 parts by mass of the resin solid content in the resin composition. parts by mass or more, more preferably 3 parts by mass or more, more preferably 5 parts by mass or more, and 10 parts by mass or more. By setting the content of the allyl compound having a glycoluril structure to the above lower limit value or more, the low dielectric properties and heat resistance of the obtained cured product tend to be further improved. Furthermore, the upper limit of the content of the allyl compound having a glycoluril structure (preferably a compound represented by formula (GU)) is preferably 40 parts by mass or less based on 100 parts by mass of the resin solid content in the resin composition. It is more preferably 30 parts by mass or less, more preferably 25 parts by mass or less, and it may be 20 parts by mass or less. By setting the content of the allyl compound having a glycoluril structure to the above upper limit or less, the low thermal expansion property of the obtained cured product tends to be further improved. The resin composition of this embodiment may contain only one type of allyl compound having a glycoluril structure, or may contain two or more types. When two or more types are contained, the total amount is preferably within the above range.
<<含有2個以上之碳-碳不飽和雙鍵之聚苯醚化合物>> 本實施形態之樹脂組成物也可含有含2個以上之碳-碳不飽和雙鍵之聚苯醚化合物。 含有2個以上之碳-碳不飽和雙鍵之聚苯醚化合物宜為在末端具有2個以上之碳-碳不飽和雙鍵的聚苯醚化合物,為在末端具有2個以上之選自由(甲基)丙烯酸基、馬來醯亞胺基、乙烯基苄基構成之群組中之基的聚苯醚化合物更佳。藉由使用這些聚苯醚化合物,會有可使印刷配線板等之介電特性及低吸水性等更有效地改善的傾向。 以下,說明它們的詳細內容。 <<Polyphenylene ether compounds containing more than 2 carbon-carbon unsaturated double bonds>> The resin composition of this embodiment may contain a polyphenylene ether compound containing two or more carbon-carbon unsaturated double bonds. The polyphenylene ether compound containing more than 2 carbon-carbon unsaturated double bonds is preferably a polyphenylene ether compound having more than 2 carbon-carbon unsaturated double bonds at the end, and the polyphenylene ether compound having more than 2 optional freedoms at the end ( A polyphenylene ether compound containing a group consisting of a meth)acrylic acid group, a maleimide group, or a vinyl benzyl group is more preferred. By using these polyphenylene ether compounds, the dielectric properties and low water absorption of printed wiring boards and the like tend to be more effectively improved. Their details are explained below.
含有2個以上之碳-碳不飽和雙鍵之聚苯醚化合物係例示具有下式(X1)表示之伸苯基醚骨架的化合物。The polyphenylene ether compound containing two or more carbon-carbon unsaturated double bonds is exemplified by a compound having a phenylene ether skeleton represented by the following formula (X1).
[化45] 式(X1)中,R 24、R 25、R 26、及R 27可為相同或相異,且表示碳數6以下之烷基、芳基、鹵素原子、或氫原子。 [Chemical 45] In formula (X1), R 24 , R 25 , R 26 , and R 27 may be the same or different, and represent an alkyl group having 6 or less carbon atoms, an aryl group, a halogen atom, or a hydrogen atom.
含有2個以上之碳-碳不飽和雙鍵之聚苯醚化合物也可更含有式(X2)表示之重複單元及/或式(X3)表示之重複單元。 [化46] 式(X2)中,R 28、R 29、R 30、R 34、及R 35可為相同或相異,且表示碳數6以下之烷基或苯基。R 31、R 32、及、R 33可為相同或相異,且為氫原子、碳數6以下之烷基或苯基。 [化47] 式(X3)中,R 36、R 37、R 38、R 39、R 40、R 41、R 42、及R 43可為相同或相異,且為氫原子、碳數6以下之烷基或苯基。-A-為碳數20以下之直鏈、分支或環狀之2價烴基。 Polyphenylene ether compounds containing more than two carbon-carbon unsaturated double bonds may further contain repeating units represented by formula (X2) and/or repeating units represented by formula (X3). [Chemical 46] In formula (X2), R 28 , R 29 , R 30 , R 34 , and R 35 may be the same or different, and represent an alkyl group or phenyl group having 6 or less carbon atoms. R 31 , R 32 , and R 33 may be the same or different, and may be a hydrogen atom, an alkyl group having 6 or less carbon atoms, or a phenyl group. [Chemical 47] In the formula (X3), R 36 , R 37 , R 38 , R 39 , R 40 , R 41 , R 42 , and R 43 may be the same or different, and may be a hydrogen atom, an alkyl group having 6 or less carbon atoms, or phenyl. -A- is a linear, branched or cyclic divalent hydrocarbon group having 20 or less carbon atoms.
含有2個以上之碳-碳不飽和雙鍵之聚苯醚化合物宜為末端之一部分或全部被乙烯性不飽和基予以官能基化之改性聚苯醚化合物(以下有時稱為「改性聚苯醚化合物(g)」),為末端具有2個以上之選自由(甲基)丙烯酸基、馬來醯亞胺基、乙烯基苄基構成之群組中之基的改性聚苯醚化合物更佳。藉由採用如此的改性聚苯醚化合物(g),可將樹脂組成物之硬化物的介電損耗正切(Df)更為減小,且可提高低吸水性、金屬箔剝離強度。它們可使用1種或也可組合使用2種以上。The polyphenylene ether compound containing more than two carbon-carbon unsaturated double bonds is preferably a modified polyphenylene ether compound in which part or all of the terminals are functionalized with ethylenically unsaturated groups (hereinafter sometimes referred to as "modified polyphenylene ether compound"). Polyphenylene ether compound (g)") is a modified polyphenylene ether having at least two terminal groups selected from the group consisting of (meth)acrylic acid groups, maleimide groups, and vinyl benzyl groups. Compounds are better. By using such a modified polyphenylene ether compound (g), the dielectric loss tangent (Df) of the cured resin composition can be further reduced, and low water absorption and metal foil peeling strength can be improved. One type of these may be used, or two or more types may be used in combination.
改性聚苯醚化合物(g)可列舉式(OP-1)表示之化合物。 [化48] 式(OP-1)中,X表示芳香族基,-(Y-O)n 2-表示聚苯醚結構,R 1、R 2、及R 3分別獨立地表示氫原子、烷基、烯基或炔基,n 1表示1~6之整數,n 2表示1~100之整數,n 3表示1~4之整數。 n 2及/或n 3為2以上之整數時,n 2個構成單元(Y-O)及/或n 3個構成單元分別可為相同也可相異。n 3宜為2以上,為2更佳。 Examples of the modified polyphenylene ether compound (g) include compounds represented by formula (OP-1). [Chemical 48] In Formula ( OP - 1 ) , Base, n 1 represents an integer from 1 to 6, n 2 represents an integer from 1 to 100, and n 3 represents an integer from 1 to 4. When n 2 and/or n 3 are an integer of 2 or more, the n 2 structural units (YO) and/or the n 3 structural units may be the same or different, respectively. n 3 is preferably 2 or more, more preferably 2.
本實施形態中的改性聚苯醚化合物(g)宜為式(OP-2)表示之化合物。 [化49] 在此,-(O-X-O)-宜以式(OP-3)及/或式(OP-4)表示。 [化50] 式(OP-3)中,R 4、R 5、R 6、R 10、及R 11可為相同或相異,且為碳數6以下之烷基或苯基。R 7、R 8、及、R 9可為相同或相異,且為氫原子、碳數6以下之烷基或苯基。 [化51] 式(OP-4)中,R 12、R 13、R 14、R 15、R 16、R 17、R 18、及、R 19可為相同或相異,且為氫原子、碳數6以下之烷基或苯基。-A-為碳數20以下之直鏈、分支或環狀之2價烴基。 The modified polyphenylene ether compound (g) in this embodiment is preferably a compound represented by formula (OP-2). [Chemical 49] Here, -(OXO)- is preferably represented by formula (OP-3) and/or formula (OP-4). [Chemical 50] In formula (OP-3), R 4 , R 5 , R 6 , R 10 , and R 11 may be the same or different, and may be an alkyl group or phenyl group having 6 or less carbon atoms. R 7 , R 8 , and R 9 may be the same or different, and may be a hydrogen atom, an alkyl group having 6 or less carbon atoms, or a phenyl group. [Chemistry 51] In the formula (OP-4), R 12 , R 13 , R 14 , R 15 , R 16 , R 17 , R 18 , and R 19 may be the same or different, and they may be a hydrogen atom and a carbon number of 6 or less. Alkyl or phenyl. -A- is a linear, branched or cyclic divalent hydrocarbon group having 20 or less carbon atoms.
又,-(Y-O)-宜以式(OP-5)表示。 [化52] 式(OP-5)中,R 20、R 21可為相同或相異,且為碳數6以下之烷基或苯基。R 22、R 23可為相同或相異,且為氫原子、碳數6以下之烷基或苯基。 式(OP-2)中,a、b表示至少任一者不為0之0~100的整數,宜為0~50之整數,為1~30之整數更佳。a及/或b為2以上之整數時,2個以上之-(Y-O)-可分別獨立地為以1種結構排列而成者,也可由2種以上之結構進行嵌段或無規排列。 In addition, -(YO)- is preferably represented by formula (OP-5). [Chemistry 52] In formula (OP-5), R 20 and R 21 may be the same or different, and may be an alkyl group or phenyl group having 6 or less carbon atoms. R 22 and R 23 may be the same or different, and may be a hydrogen atom, an alkyl group having 6 or less carbon atoms, or a phenyl group. In the formula (OP-2), a and b represent at least one of them that is not 0 and an integer from 0 to 100, preferably an integer from 0 to 50, and more preferably an integer from 1 to 30. When a and/or b are an integer of 2 or more, two or more -(YO)- may be independently arranged in one structure, or two or more structures may be arranged in blocks or randomly.
式(OP-4)中的-A-可列舉例如:亞甲基、亞乙基、1-甲基亞乙基、1,1-亞丙基、1,4-伸苯基雙(1-甲基亞乙)基、1,3-伸苯基雙(1-甲基亞乙)基、環亞己基、苯基亞甲基、萘基亞甲基、1-苯基亞乙基等2價有機基,但不限於此。Examples of -A- in the formula (OP-4) include: methylene, ethylene, 1-methylethylene, 1,1-propylene, 1,4-phenylenebis(1- Methylethylene), 1,3-phenylbis(1-methylethylene), cyclohexylene, phenylmethylene, naphthylmethylene, 1-phenylethylene, etc. 2 Valence organic base, but not limited to this.
上述改性聚苯醚化合物(g)之中,宜為R 4、R 5、R 6、R 10、R 11、R 20、及R 21為碳數3以下之烷基,且R 7、R 8、R 9、R 12、R 13、R 14、R 15、R 16、R 17、R 18、R 19、R 22、及R 23為氫原子或碳數3以下之烷基的聚苯醚化合物,為式(OP-3)或式(OP-4)表示之-(O-X-O)-為式(OP-9)、式(OP-10)及/或式(OP-11),且式(OP-5)表示之-(Y-O)-為式(OP-12)或式(OP-13)特佳。a及/或b為2以上之整數時,2個以上之-(Y-O)-可分別獨立地為以2個以上之式(OP-12)及/或式(OP-13)排列而成之結構、或由式(OP-12)及式(OP-13)進行嵌段或無規排列而成的結構。 Among the above-mentioned modified polyphenylene ether compounds (g), it is preferable that R 4 , R 5 , R 6 , R 10 , R 11 , R 20 and R 21 are alkyl groups having 3 or less carbon atoms, and R 7 and R 8. Polyphenylene ether in which R 9 , R 12 , R 13 , R 14 , R 15 , R 16 , R 17 , R 18 , R 19 , R 22 , and R 23 are hydrogen atoms or alkyl groups with less than 3 carbon atoms. The compound is -(OXO) represented by formula (OP-3) or formula (OP-4) - is formula (OP-9), formula (OP-10) and/or formula (OP-11), and formula ( The -(YO)- represented by OP-5) is particularly preferably the formula (OP-12) or the formula (OP-13). When a and/or b is an integer of 2 or more, the two or more -(YO)- can be independently arranged by two or more formulas (OP-12) and/or formula (OP-13) structure, or a structure formed by block or random arrangement of Formula (OP-12) and Formula (OP-13).
[化53] [化54] 式(OP-10)中,R 44、R 45、R 46、及R 47可為相同或相異,且為氫原子或甲基。-B-為碳數20以下之直鏈、分支或環狀之2價烴基。 -B-可列舉和式(OP-4)中的-A-之具體例相同者作為具體例。 [化55] 式(OP-11)中,-B-為碳數20以下之直鏈、分支或環狀之2價烴基。 -B-可列舉和式(OP-4)中的-A-之具體例相同者作為具體例。 [化56] [化57] [Chemistry 53] [Chemistry 54] In formula (OP-10), R 44 , R 45 , R 46 , and R 47 may be the same or different, and may be a hydrogen atom or a methyl group. -B- is a linear, branched or cyclic divalent hydrocarbon group having 20 or less carbon atoms. Specific examples of -B- are the same as those of -A- in formula (OP-4). [Chemical 55] In the formula (OP-11), -B- is a linear, branched or cyclic divalent hydrocarbon group having 20 or less carbon atoms. Specific examples of -B- are the same as those of -A- in formula (OP-4). [Chemical 56] [Chemistry 57]
其它含有2個以上之碳-碳不飽和雙鍵之聚苯醚化合物的詳細內容可參酌日本特開2018-016709號公報之記載,並將這些內容納入本說明書中。For details on other polyphenylene ether compounds containing more than two carbon-carbon unsaturated double bonds, please refer to the records in Japanese Patent Application Laid-Open No. 2018-016709, and these contents are incorporated into this specification.
含有2個以上之碳-碳不飽和雙鍵之聚苯醚化合物(宜為改性聚苯醚化合物(g))之利用GPC(凝膠滲透層析)法所為之聚苯乙烯換算的數目平均分子量(詳細係依循後述實施例所記載之方法)宜為500以上且3,000以下。數目平均分子量藉由為500以上,會有將本實施形態之樹脂組成物製成塗膜狀時,更進一步抑制黏附的傾向。數目平均分子量藉由為3,000以下,會有更進一步改善對溶劑之溶解性的傾向。 又,含有2個以上之碳-碳不飽和雙鍵之聚苯醚化合物(宜為改性聚苯醚化合物(g))之利用GPC所為之聚苯乙烯換算的重量平均分子量(詳細係依循後述實施例所記載之方法)宜為800以上且10,000以下,為800以上且5,000以下更佳。藉由設為前述下限值以上,會有樹脂組成物之硬化物的相對介電常數(Dk)及介電損耗正切(Df)變得更低的傾向,藉由設為上述上限值以下,會有更為改善後述製作清漆等時對溶劑之樹脂組成物的溶解性、低黏度性及成形性的傾向。 此外,為改性聚苯醚化合物(g)時之末端的碳-碳不飽和雙鍵當量,就每1個碳-碳不飽和雙鍵而言,宜為400~5000g,為400~2500g更佳。藉由設為前述下限值以上,會有樹脂組成物之硬化物的相對介電常數(Dk)及介電損耗正切(Df)變得更低的傾向。藉由設為上述上限值以下,會有更為改善對溶劑之樹脂組成物的溶解性、低黏度性及成形性的傾向。 Average number of polystyrene-converted polyphenylene ether compounds (preferably modified polyphenylene ether compounds (g)) containing two or more carbon-carbon unsaturated double bonds using GPC (gel permeation chromatography) method The molecular weight is preferably 500 or more and 3,000 or less (in detail, following the method described in the Examples described later). When the number average molecular weight is 500 or more, when the resin composition of this embodiment is formed into a coating film, adhesion tends to be further suppressed. When the number average molecular weight is 3,000 or less, the solubility in solvents tends to be further improved. In addition, the polystyrene-converted weight average molecular weight of a polyphenylene ether compound containing two or more carbon-carbon unsaturated double bonds (preferably a modified polyphenylene ether compound (g)) using GPC (details are as follows) The method described in the Examples) is preferably 800 or more and 10,000 or less, more preferably 800 or more and 5,000 or less. By setting it above the above-mentioned lower limit value, the relative dielectric constant (Dk) and dielectric loss tangent (Df) of the cured product of the resin composition tend to become lower. By setting it below the above-mentioned upper limit value, , there will be a tendency to further improve the solubility, low viscosity and formability of the resin composition in solvents when making varnishes and the like described later. In addition, when the modified polyphenylene ether compound (g) is used, the terminal carbon-carbon unsaturated double bond equivalent per carbon-carbon unsaturated double bond is preferably 400 to 5000 g, more preferably 400 to 2500 g. good. By setting it to the above lower limit or more, the relative dielectric constant (Dk) and the dielectric loss tangent (Df) of the cured product of the resin composition tend to become lower. By setting it below the above upper limit, the solubility, low viscosity and moldability of the resin composition in a solvent tend to be further improved.
本實施形態之樹脂組成物含有含2個以上之碳-碳不飽和雙鍵之聚苯醚化合物時,含有2個以上之碳-碳不飽和雙鍵之聚苯醚化合物的含量之下限值,相對於樹脂組成物中之樹脂固體成分100質量份,宜為1質量份以上,為3質量份以上更佳,為5質量份以上再更佳,為7質量份以上又更佳,為10質量份以上再更佳。藉由設為前述下限值以上,會有更為改善得到的硬化物之低吸水性及低介電特性(Dk及/或Df)的傾向。又,含有2個以上之碳-碳不飽和雙鍵之聚苯醚化合物的含量之上限值相對於樹脂組成物中之樹脂固體成分100質量份,宜為50質量份以下,為45質量份以下更佳,為40質量份以下再更佳,為35質量份以下又更佳,為30質量份以下再更佳,為25質量份以下又更佳,也可為20質量份以下。藉由設為前述上限值以下,會有更為改善得到的硬化物之耐熱性及耐藥品性的傾向。 本實施形態中的樹脂組成物可僅含1種含有2個以上之碳-碳不飽和雙鍵之聚苯醚化合物,也可含有2種以上。含有2種以上時,合計量宜為上述範圍。 When the resin composition of this embodiment contains a polyphenylene ether compound containing two or more carbon-carbon unsaturated double bonds, the lower limit of the content of the polyphenylene ether compound containing two or more carbon-carbon unsaturated double bonds is , relative to 100 parts by mass of the resin solid content in the resin composition, it is preferably at least 1 part by mass, more preferably at least 3 parts by mass, more preferably at least 5 parts by mass, more preferably at least 7 parts by mass, and 10 Quality parts and above are better. By setting it to above the lower limit, the low water absorbency and low dielectric properties (Dk and/or Df) of the obtained cured material tend to be further improved. Furthermore, the upper limit of the content of the polyphenylene ether compound containing two or more carbon-carbon unsaturated double bonds is preferably 50 parts by mass or less and 45 parts by mass relative to 100 parts by mass of the resin solid content in the resin composition. More preferably, it is not more than 40 parts by mass, still more preferably not more than 35 parts by mass, still more preferably not more than 30 parts by mass, still more preferably not more than 25 parts by mass, and may be not more than 20 parts by mass. By setting it below the upper limit, the heat resistance and chemical resistance of the obtained cured product tend to be further improved. The resin composition in this embodiment may contain only one type of polyphenylene ether compound containing two or more carbon-carbon unsaturated double bonds, or may contain two or more types. When two or more types are contained, the total amount is preferably within the above range.
又,本實施形態中的樹脂組成物也可設為實質上不含含有2個以上之碳-碳不飽和雙鍵之聚苯醚化合物之構成。實質上不含係指含有2個以上之碳-碳不飽和雙鍵之聚苯醚化合物的含量相對於樹脂組成物中之樹脂固體成分100質量份為未達0.1質量份,宜為未達0.01質量份,此外也可為未達0.001質量份。Moreover, the resin composition in this embodiment may have a structure which does not substantially contain the polyphenylene ether compound containing two or more carbon-carbon unsaturated double bonds. Substantially free means that the content of a polyphenylene ether compound containing two or more carbon-carbon unsaturated double bonds is less than 0.1 parts by mass relative to 100 parts by mass of the resin solid content in the resin composition, preferably less than 0.01 parts by mass, and may be less than 0.001 parts by mass.
本實施形態之樹脂組成物含有其它熱硬化性化合物(C)時,其含量(總量)相對於樹脂固體成分100質量份,宜為1質量份以上,為5質量份以上更佳,為10質量份以上再更佳,為20質量份以上又更佳,也可為30質量份以上。藉由設為前述下限值以上,會有更為改善得到的硬化物之耐熱性、鍍敷密合性及低熱膨脹性等的傾向。又,其它熱硬化性化合物(C)的含量之上限值,相對於樹脂固體成分100質量份,宜為50質量份以下,為45質量份以下更佳,為40質量份以下再更佳。藉由設為前述上限值以下,會有得到的硬化物之低介電特性(Dk及/或Df)及低吸水性更為改善的傾向。 本實施形態之樹脂組成物可僅含1種其它熱硬化性化合物(C),也可含有2種以上。含有2種以上時,合計量宜為上述範圍。 When the resin composition of this embodiment contains other thermosetting compounds (C), its content (total amount) is preferably 1 part by mass or more, more preferably 5 parts by mass or more, and 10 parts by mass based on 100 parts by mass of the resin solid content. More preferably, it is more than 20 parts by mass, more preferably not less than 20 parts by mass, and it may be more than 30 parts by mass. By setting it to above the lower limit, the heat resistance, plating adhesion, low thermal expansion, etc. of the obtained hardened material tend to be further improved. Furthermore, the upper limit of the content of the other thermosetting compound (C) is preferably 50 parts by mass or less, more preferably 45 parts by mass or less, and still more preferably 40 parts by mass or less based on 100 parts by mass of the resin solid content. By setting it below the upper limit, the low dielectric properties (Dk and/or Df) and low water absorption of the obtained cured product tend to be further improved. The resin composition of this embodiment may contain only one type of other thermosetting compound (C), or may contain two or more types. When two or more types are contained, the total amount is preferably within the above range.
<填充材(D)> 本實施形態之樹脂組成物宜含有填充材(D)。藉由含有填充材(D),可更為改善樹脂組成物、或其硬化物之介電特性(低介電常數性、低介電損耗正切性等)、耐燃性、低熱膨脹性等物性。 又,本實施形態使用的填充材(D)之低介電特性(Dk及/或Df)優良更佳。例如,本實施形態使用的填充材(D)依循共振腔擾動法(resonant cavity perturbation method)所測得的在頻率10GHz時的相對介電常數(Dk)宜為8.0以下,為6.0以下更佳,為4.0以下再更佳。又,相對介電常數之下限值例如為2.0以上較實際。又,本實施形態使用的填充材(D)依循共振腔擾動法所測得的在頻率10GHz時的介電損耗正切(Df)宜為0.05以下,為0.01以下更佳。又,介電損耗正切之下限值例如為0.0001以上較實際。 <Filling material (D)> The resin composition of this embodiment preferably contains filler (D). By containing the filler (D), physical properties such as dielectric characteristics (low dielectric constant, low dielectric loss tangent, etc.), flame resistance, and low thermal expansion of the resin composition or its hardened product can be further improved. Moreover, it is more preferable that the filler (D) used in this embodiment has excellent low dielectric properties (Dk and/or Df). For example, the relative dielectric constant (Dk) of the filling material (D) used in this embodiment measured by the resonant cavity perturbation method at a frequency of 10 GHz is preferably 8.0 or less, and more preferably 6.0 or less. It is better if it is below 4.0. In addition, it is more practical that the lower limit value of the relative dielectric constant is, for example, 2.0 or more. In addition, the dielectric loss tangent (Df) of the filler (D) used in this embodiment measured by the resonant cavity perturbation method at a frequency of 10 GHz is preferably 0.05 or less, more preferably 0.01 or less. In addition, it is more practical that the lower limit value of the dielectric loss tangent is, for example, 0.0001 or more.
就本實施形態所使用的填充材(D)而言,其種類並無特別限制,可理想地使用發明所屬技術領域中具有通常知識者所常用者。具體可列舉:天然二氧化矽、熔融二氧化矽、合成二氧化矽、非晶態二氧化矽、氣相二氧化矽(AEROSIL)、中空二氧化矽等二氧化矽類;氧化鋁、白碳、鈦白、氧化鈦、氧化鋅、氧化鎂、氧化鋯等金屬氧化物;硼酸鋅、錫酸鋅、鎂橄欖石(forsterite)、鈦酸鋇、鈦酸鍶、鈦酸鈣等複合氧化物;氮化硼、凝聚氮化硼、氮化矽、氮化鋁等氮化物;氫氧化鋁、氫氧化鋁加熱處理品(將氫氧化鋁進行加熱處理並將結晶水的一部分除去者)、軟水鋁石(boehmite)、氫氧化鎂等金屬氫氧化物(包含水合物);氧化鉬、鉬酸鋅等鉬化合物;硫酸鋇、黏土、高嶺土(kaolin)、滑石(talc)、煅燒黏土、煅燒高嶺土(kaolin)、煅燒滑石(talc)、雲母、E-玻璃、A-玻璃、NE-玻璃、C-玻璃、L-玻璃、D-玻璃、S-玻璃、M-玻璃G20、玻璃短纖維(包含E玻璃、T玻璃、D玻璃、S玻璃、Q玻璃等玻璃微粉末類)、中空玻璃、球狀玻璃等無機系填充材;除此之外,還可列舉苯乙烯型、丁二烯型、丙烯酸型等之橡膠粉末、核-殼型之橡膠粉末、聚矽氧樹脂粉末、聚矽氧橡膠粉末、聚矽氧複合粉末等有機系填充材等。 在本實施形態中,無機填充材宜包含選自由二氧化矽、氫氧化鋁、氮化鋁、氮化硼、鎂橄欖石、氧化鈦、鈦酸鋇、鈦酸鍶、及鈦酸鈣構成之群組中之1種以上更佳,考慮低介電特性(Dk及/或Df)之觀點,包含選自由二氧化矽、及氫氧化鋁構成之群組中之1種以上更佳,包含二氧化矽再更佳。藉由使用這些無機填充材,會更為改善樹脂組成物之硬化物的耐熱性、介電特性、熱膨脹特性、尺寸安定性、阻燃性等特性。 The type of filler (D) used in this embodiment is not particularly limited, and those commonly used by those with ordinary knowledge in the technical field to which the invention pertains can be preferably used. Specific examples include: natural silica, fused silica, synthetic silica, amorphous silica, fumed silica (AEROSIL), hollow silica and other silicas; alumina, white carbon , titanium dioxide, titanium oxide, zinc oxide, magnesium oxide, zirconium oxide and other metal oxides; zinc borate, zinc stannate, forsterite (forsterite), barium titanate, strontium titanate, calcium titanate and other composite oxides; Nitrides such as boron nitride, condensed boron nitride, silicon nitride, aluminum nitride, etc.; aluminum hydroxide, aluminum hydroxide heat-treated products (aluminum hydroxide is heated to remove part of the crystal water), soft aluminum Metal hydroxides (including hydrates) such as boehmite and magnesium hydroxide; molybdenum compounds such as molybdenum oxide and zinc molybdate; barium sulfate, clay, kaolin, talc, calcined clay, calcined kaolin ( kaolin), calcined talc (talc), mica, E-glass, A-glass, NE-glass, C-glass, L-glass, D-glass, S-glass, M-glass G20, short glass fibers (including E Glass, T glass, D glass, S glass, Q glass and other glass fine powders), insulating glass, spherical glass and other inorganic filling materials; in addition, styrene type, butadiene type, acrylic type Organic fillers such as type rubber powder, core-shell rubber powder, polysilicone resin powder, polysilicone rubber powder, polysilicone composite powder, etc. In this embodiment, the inorganic filler preferably contains a material selected from the group consisting of silicon dioxide, aluminum hydroxide, aluminum nitride, boron nitride, forsterite, titanium oxide, barium titanate, strontium titanate, and calcium titanate. More preferably, one or more types from the group are selected. From the viewpoint of low dielectric properties (Dk and/or Df), one or more types selected from the group consisting of silicon dioxide and aluminum hydroxide is more preferred, including both. Silicon oxide is even better. By using these inorganic fillers, the heat resistance, dielectric properties, thermal expansion properties, dimensional stability, flame retardancy and other properties of the cured resin composition will be further improved.
本實施形態之樹脂組成物中的填充材(D)的含量可因應所期望的特性而適當地設定,並無特別限制,相對於樹脂組成物中之樹脂固體成分100質量份,宜為10質量份以上,為20質量份以上更佳,為40質量份以上再更佳,為60質量份以上又更佳,為80質量份以上再更佳。藉由設為前述下限值以上,會有更為改善得到的硬化物之低熱膨脹性及低介電損耗正切性的傾向。又,填充材(D)的含量之上限值相對於樹脂固體成分100質量份,宜為1600質量份以下,為1000質量份以下更佳,為500質量份以下再更佳,為300質量份以下又更佳,為250質量份以下再更佳,也可為200質量份以下、120質量份以下。藉由設為前述上限值以下,會有更為改善樹脂組成物之成形性的傾向。 本實施形態之樹脂組成物中,就理想的實施形態之一例而言,宜為填充材(D)的含量為排除溶劑之成分的1~95質量%之態樣,為30質量%~80質量%之態樣較理想。 本實施形態之樹脂組成物中,可僅含1種填充材(D),也可含有2種以上。含有2種以上時,合計量宜為上述範圍。 The content of the filler (D) in the resin composition of this embodiment can be appropriately set according to the desired characteristics and is not particularly limited. It is preferably 10 parts by mass relative to 100 parts by mass of the resin solid content in the resin composition. parts by mass or more, more preferably at least 20 parts by mass, more preferably at least 40 parts by mass, more preferably at least 60 parts by mass, and more preferably at least 80 parts by mass. By setting it to the lower limit value or more, the low thermal expansion and low dielectric loss tangent of the obtained hardened material tend to be further improved. Moreover, the upper limit of the content of the filler (D) is preferably 1,600 parts by mass or less, more preferably 1,000 parts by mass or less, and still more preferably 300 parts by mass or less, based on 100 parts by mass of the resin solid content. It is more preferably not more than 250 parts by mass, and still more preferably not more than 200 parts by mass, or not more than 120 parts by mass. By setting it below the upper limit, the moldability of the resin composition tends to be further improved. In the resin composition of this embodiment, as an example of an ideal embodiment, it is preferable that the content of the filler (D) is 1 to 95 mass % of the components excluding the solvent, and is 30 to 80 mass %. % is more ideal. The resin composition of this embodiment may contain only one type of filler (D), or may contain two or more types. When two or more types are contained, the total amount is preferably within the above range.
本實施形態之樹脂組成物中,使用填充材(D)時,尤其使用無機填充材時,也可更含有矽烷偶聯劑。藉由含有矽烷偶聯劑,會有更為改善填充材(D)的分散性、樹脂成分及填充材(D)及後述基材的黏接強度的傾向。 矽烷偶聯劑並無特別限制,可列舉通常使用於無機物之表面處理的矽烷偶聯劑,可列舉:胺基矽烷系化合物(例如γ-胺基丙基三乙氧基矽烷、N-β-(胺基乙基)-γ-胺基丙基三甲氧基矽烷等)、環氧矽烷系化合物(例如γ-環氧丙氧基丙基三甲氧基矽烷等)、乙烯基矽烷系化合物(例如乙烯基三甲氧基矽烷等)、苯乙烯矽烷系化合物(例如對苯乙烯三甲氧基矽烷等)、丙烯酸矽烷系化合物(例如γ-丙烯醯氧基丙基三甲氧基矽烷等)、陽離子矽烷系化合物(例如N-β-(N-乙烯基苄基胺基乙基)-γ-胺基丙基三甲氧基矽烷鹽酸鹽等)、苯基矽烷系化合物等。矽烷偶聯劑可單獨使用1種,或組合使用2種以上。 矽烷偶聯劑的含量並無特別限制,相對於樹脂固體成分100質量份,也可為0.1~5.0質量份。 In the resin composition of this embodiment, when a filler (D) is used, especially when an inorganic filler is used, a silane coupling agent may be further included. By containing a silane coupling agent, the dispersibility of the filler (D), the resin component, and the bonding strength between the filler (D) and the base material described below tend to be further improved. The silane coupling agent is not particularly limited, and examples thereof include silane coupling agents commonly used for surface treatment of inorganic substances, such as aminosilane compounds (such as γ-aminopropyltriethoxysilane, N-β- (Aminoethyl)-γ-aminopropyltrimethoxysilane, etc.), epoxysilane compounds (such as γ-glycidoxypropyltrimethoxysilane, etc.), vinylsilane compounds (such as Vinyltrimethoxysilane, etc.), styrene silane compounds (such as p-styrenetrimethoxysilane, etc.), acrylic silane compounds (such as γ-acryloxypropyltrimethoxysilane, etc.), cationic silane compounds Compounds (for example, N-β-(N-vinylbenzylaminoethyl)-γ-aminopropyltrimethoxysilane hydrochloride, etc.), phenylsilane compounds, etc. A silane coupling agent can be used individually by 1 type, or in combination of 2 or more types. The content of the silane coupling agent is not particularly limited, and may be 0.1 to 5.0 parts by mass relative to 100 parts by mass of the resin solid content.
<分子量未達1000且分子內含有1個含碳-碳不飽和鍵之有機基的低分子乙烯基化合物> 本實施形態之樹脂組成物也可含有分子量未達1000且分子內含有1個含碳-碳不飽和鍵之有機基的低分子乙烯基化合物(以下有時簡稱為「低分子乙烯基化合物」)。藉由摻合低分子乙烯基化合物,會有更為改善得到的硬化物之低介電特性(Dk及/或Df)及吸濕耐熱性的傾向。 在此,構成前述含碳-碳不飽和鍵之有機基的碳-碳不飽和鍵,係不包含以芳香環的一部分之形式含有之概念。另一方面,係包含以非芳香環的一部分之形式含有之碳-碳不飽和鍵的概念。以非芳香環的一部分之形式含有之碳-碳不飽和鍵的例,可列舉環己烯基等。又,亦包含直鏈或支鏈之有機基除末端以外的部分,亦即直鏈或支鏈中所含的碳-碳不飽和鍵(例如伸乙烯基)之概念。 本實施形態中,前述含碳-碳不飽和鍵之有機基宜具有CH 2=C(X)-(X為氫原子或甲基)結構。如此,藉由採用分子之端部含有碳-碳不飽和鍵之化合物,可更有效地和具有式(V)表示之構成單元的聚合物(V)所具有的乙烯基進行反應。 前述含碳-碳不飽和鍵之有機基為選自由乙烯基、烯丙基、丙烯酸基、及甲基丙烯酸基構成之群組中之1個更佳,為乙烯基再更佳。 <Low molecular vinyl compound with a molecular weight of less than 1000 and containing one organic group containing a carbon-carbon unsaturated bond in the molecule> The resin composition of this embodiment may also contain a molecular weight of less than 1000 and containing one carbon-containing unsaturated bond in the molecule. -Low-molecular vinyl compounds with organic groups of unsaturated carbon bonds (hereinafter sometimes referred to as "low-molecular vinyl compounds"). By blending a low molecular weight vinyl compound, the low dielectric properties (Dk and/or Df) and moisture absorption and heat resistance of the obtained cured product tend to be further improved. Here, the concept that the carbon-carbon unsaturated bond constituting the organic group containing the carbon-carbon unsaturated bond does not include it as part of an aromatic ring. On the other hand, it is a concept including a carbon-carbon unsaturated bond contained as part of a non-aromatic ring. Examples of the carbon-carbon unsaturated bond contained as part of a non-aromatic ring include cyclohexenyl and the like. In addition, it also includes the concept of parts other than the ends of linear or branched organic groups, that is, carbon-carbon unsaturated bonds (such as vinylene groups) contained in the linear or branched chain. In this embodiment, the organic group containing a carbon-carbon unsaturated bond preferably has a CH 2 =C(X)-(X is a hydrogen atom or a methyl group) structure. In this way, by using a compound containing a carbon-carbon unsaturated bond at the end of the molecule, it can react more efficiently with the vinyl group of the polymer (V) having the structural unit represented by the formula (V). The aforementioned organic group containing a carbon-carbon unsaturated bond is more preferably one selected from the group consisting of vinyl, allyl, acrylic, and methacrylic groups, and even more preferably vinyl.
本實施形態使用的低分子乙烯基化合物也宜僅由選自由碳原子、氫原子、氧原子、氮原子、及矽原子構成之群組中之原子所構成,僅由選自由碳原子、氫原子、氧原子、及矽原子構成之群組中之原子所構成更佳,僅由選自由碳原子、氫原子、及氧原子構成之群組中之原子所構成再更佳。 本實施形態使用的低分子乙烯基化合物也可具有極性基,亦可不具有極性基。本實施形態使用的低分子乙烯基化合物宜為不具有極性基者。極性基係例示:胺基、羧基、羥基、硝基。 The low-molecular vinyl compound used in this embodiment is preferably composed only of atoms selected from the group consisting of carbon atoms, hydrogen atoms, oxygen atoms, nitrogen atoms, and silicon atoms. More preferably, it is composed of atoms from the group consisting of carbon atoms, oxygen atoms, and silicon atoms. Even more preferably, it is composed only of atoms selected from the group consisting of carbon atoms, hydrogen atoms, and oxygen atoms. The low molecular weight vinyl compound used in this embodiment may or may not have a polar group. The low molecular weight vinyl compound used in this embodiment is preferably one that does not have a polar group. Examples of polar groups include amino group, carboxyl group, hydroxyl group, and nitro group.
本實施形態中,低分子乙烯基化合物之分子量宜為70以上,為80以上更佳,為90以上再更佳。藉由設為前述下限值以上,會有可抑制低分子乙烯基化合物從本實施形態之樹脂組成物或其硬化物等揮發的傾向。低分子乙烯基化合物之分子量之上限宜為500以下,為400以下更佳,為300以下再更佳,為200以下又更佳,也可為150以下。藉由設為前述上限值以下,會有更為改善提高和具有式(V)表示之構成單元的聚合物(V)之反應性的效果之傾向。 本實施形態之樹脂組成物含有2種以上之低分子乙烯基化合物時,低分子乙烯基化合物之平均分子量值宜包含於上述範圍內,各別的化合物之分子量包含於上述理想的範圍內更佳。 In this embodiment, the molecular weight of the low-molecular vinyl compound is preferably 70 or more, more preferably 80 or more, and still more preferably 90 or more. By setting it as above the said lower limit value, the tendency of the low molecular weight vinyl compound to volatilize from the resin composition of this embodiment, its hardened|cured material, etc. can be suppressed. The upper limit of the molecular weight of the low molecular vinyl compound is preferably 500 or less, more preferably 400 or less, more preferably 300 or less, more preferably 200 or less, and may also be 150 or less. By setting it below the upper limit, the effect of improving the reactivity with the polymer (V) having the structural unit represented by the formula (V) tends to be further improved. When the resin composition of this embodiment contains two or more types of low molecular vinyl compounds, the average molecular weight value of the low molecular vinyl compound is preferably within the above range, and the molecular weight of each compound is more preferably within the above ideal range. .
本實施形態中,低分子乙烯基化合物的沸點宜為110℃以上,為115℃以上更佳,為120℃以上再更佳。藉由設為前述下限值以上,可抑制使樹脂組成物進行熱硬化時之低分子乙烯基化合物的揮發,且可更有效地使具有式(V)表示之構成單元的聚合物(V)所具有的乙烯基和低分子乙烯基化合物進行反應。低分子乙烯基化合物的沸點宜為300℃以下,為250℃以下更佳,為200℃以下再更佳。藉由設為前述上限值以下,可使其不易以殘溶劑的形式殘留於硬化物中。 本實施形態之樹脂組成物含有2種以上之低分子乙烯基化合物時,沸點的平均值落在上述範圍內即可,但各別的化合物之沸點宜包含於上述理想的範圍內。 In this embodiment, the boiling point of the low molecular weight vinyl compound is preferably 110°C or higher, more preferably 115°C or higher, still more preferably 120°C or higher. By being equal to or more than the aforementioned lower limit, volatilization of the low-molecular vinyl compound when the resin composition is thermally cured can be suppressed, and the polymer (V) having the structural unit represented by the formula (V) can be more effectively cured. The vinyl groups contained react with low molecular weight vinyl compounds. The boiling point of the low molecular weight vinyl compound is preferably 300°C or lower, more preferably 250°C or lower, still more preferably 200°C or lower. By setting it below the upper limit, it becomes less likely to remain in the cured product as a residual solvent. When the resin composition of this embodiment contains two or more low molecular weight vinyl compounds, the average boiling point only needs to fall within the above range, but the boiling point of each compound is preferably within the above ideal range.
低分子乙烯基化合物係例示:(甲基)丙烯酸酯化合物、芳香族乙烯基化合物(宜為苯乙烯系化合物)、飽和脂肪酸乙烯酯化合物、氰化乙烯基化合物、乙烯性不飽和羧酸、乙烯性不飽和羧酸酐、乙烯性不飽和二羧酸單烷基酯、乙烯性不飽和羧醯胺、乙烯基矽烷化合物(例如乙烯基三烷氧基矽烷等)、丙烯酸基矽烷化合物(例如丙烯酸基三烷氧基矽烷等)、甲基丙烯酸基矽烷化合物(例如甲基丙烯酸基三烷氧基矽烷等)、苯乙烯矽烷化合物(例如苯乙烯三烷氧基矽烷等)等。 低分子乙烯基化合物之第一形態係選自由(甲基)丙烯酸酯化合物、芳香族乙烯基化合物、飽和脂肪酸乙烯酯化合物、氰化乙烯基化合物、乙烯性不飽和羧酸、乙烯性不飽和羧酸酐、乙烯性不飽和二羧酸單烷基酯、及乙烯性不飽和羧醯胺構成之群組中之至少1種。 低分子乙烯基化合物之第二形態係選自由(甲基)丙烯酸酯化合物、芳香族乙烯基化合物、飽和脂肪酸乙烯酯化合物、乙烯基矽烷化合物、丙烯酸基矽烷化合物、甲基丙烯酸基矽烷化合物、苯乙烯矽烷化合物構成之群組中之至少1種,宜為芳香族乙烯基化合物及/或乙烯基矽烷化合物。 低分子乙烯基化合物之具體例係例示:甲基苯乙烯、乙基乙烯基苯、乙烯基三甲氧基矽烷、乙烯基三乙氧基矽烷。 Examples of low molecular weight vinyl compounds: (meth)acrylate compounds, aromatic vinyl compounds (preferably styrene compounds), saturated fatty acid vinyl ester compounds, cyanide vinyl compounds, ethylenically unsaturated carboxylic acids, ethylene Unsaturated carboxylic anhydride, ethylenically unsaturated dicarboxylic acid monoalkyl ester, ethylenically unsaturated carboxamide, vinyl silane compound (such as vinyl trialkoxy silane, etc.), acrylic silane compound (such as acrylic silane compound) trialkoxysilane, etc.), methacrylic silane compounds (such as methacrylic trialkoxysilane, etc.), styrene silane compounds (such as styrene trialkoxysilane, etc.), etc. The first form of the low molecular vinyl compound is selected from the group consisting of (meth)acrylate compounds, aromatic vinyl compounds, saturated fatty acid vinyl ester compounds, cyanide vinyl compounds, ethylenically unsaturated carboxylic acids, and ethylenically unsaturated carboxylic acids. At least one kind from the group consisting of acid anhydride, ethylenically unsaturated dicarboxylic acid monoalkyl ester, and ethylenically unsaturated carboxamide. The second form of the low molecular vinyl compound is selected from (meth)acrylate compounds, aromatic vinyl compounds, saturated fatty acid vinyl ester compounds, vinyl silane compounds, acrylic silane compounds, methacrylic silane compounds, benzene At least one type of the group consisting of vinylsilane compounds is preferably an aromatic vinyl compound and/or a vinylsilane compound. Specific examples of low molecular weight vinyl compounds include methylstyrene, ethylvinylbenzene, vinyltrimethoxysilane, and vinyltriethoxysilane.
本實施形態之樹脂組成物中,低分子乙烯基化合物的含量相對於樹脂固體成分100質量份,宜為1質量份以上,為2質量份以上更佳,為2.5質量份以上再更佳。藉由設為前述下限值以上,會有得到的硬化物中之未反應官能基減少,並改善得到的硬化物之吸濕耐熱性的傾向。又,低分子乙烯基化合物的含量之上限值相對於樹脂固體成分100質量份,宜為30質量份以下,為20質量份以下更佳,為10質量份以下再更佳,為8質量份以下又更佳,為5質量份以下再更佳。藉由設為前述上限值以下,會有更為改善得到的硬化物之低介電特性(Dk及/或Df)的傾向。 本實施形態之樹脂組成物可僅含1種低分子乙烯基化合物,也可含有2種以上。含有2種以上時,合計量宜為上述範圍。 In the resin composition of this embodiment, the content of the low molecular vinyl compound is preferably 1 part by mass or more, more preferably 2 parts by mass or more, and more preferably 2.5 parts by mass or more based on 100 parts by mass of the resin solid content. By making it the said lower limit value or more, the unreacted functional group in the hardened|cured material obtained tends to reduce, and there exists a tendency to improve the moisture absorption and heat resistance of the hardened|cured material obtained. In addition, the upper limit of the content of the low molecular vinyl compound is preferably 30 parts by mass or less, more preferably 20 parts by mass or less, and still more preferably 8 parts by mass or less, based on 100 parts by mass of the resin solid content. More preferably not more than 5 parts by mass. By setting it below the upper limit, the low dielectric properties (Dk and/or Df) of the obtained hardened material tend to be further improved. The resin composition of this embodiment may contain only one low molecular weight vinyl compound, or may contain two or more types. When two or more types are contained, the total amount is preferably within the above range.
本實施形態之樹脂組成物中,具有式(V)表示之構成單元的聚合物(V)和低分子乙烯基化合物的質量比率,相對於具有式(V)表示之構成單元的聚合物(V)1宜為0.025以上,為0.05以上更佳。藉由設為前述下限值以上,會有得到的硬化物中之未反應官能基減少,並改善得到的硬化物之吸濕耐熱性的傾向。上述具有式(V)表示之構成單元的聚合物(V)和低分子乙烯基化合物的質量比率之上限,相對於具有式(V)表示之構成單元的聚合物(V)1宜為0.7以下,為0.5以下更佳,為0.4以下再更佳,為0.3以下又更佳,也可為0.25以下。藉由設為前述上限值以下,會有更為改善得到的硬化物之低介電特性(Dk及/或Df)的傾向。In the resin composition of this embodiment, the mass ratio of the polymer (V) having the structural unit represented by the formula (V) and the low molecular vinyl compound is relative to the mass ratio of the polymer (V) having the structural unit represented by the formula (V). )1 is preferably 0.025 or more, more preferably 0.05 or more. By making it the said lower limit value or more, the unreacted functional group in the hardened|cured material obtained tends to reduce, and there exists a tendency to improve the moisture absorption and heat resistance of the hardened|cured material obtained. The upper limit of the mass ratio of the polymer (V) having the structural unit represented by the formula (V) and the low molecular weight vinyl compound is preferably 0.7 or less relative to the polymer (V) 1 having the structural unit represented by the formula (V). , it is more preferably 0.5 or less, more preferably 0.4 or less, still more preferably 0.3 or less, and may also be 0.25 or less. By setting it below the upper limit, the low dielectric properties (Dk and/or Df) of the obtained hardened material tend to be further improved.
<具有乙烯性不飽和基之寡聚物> 本實施形態之樹脂組成物中,為了提高熱硬化性及活性能量射線所為之硬化性(例如紫外線所為之光硬化性等),也可合併使用具有乙烯性不飽和基之寡聚物。本實施形態所使用的具有乙烯性不飽和基之寡聚物,若為1分子中具有1個以上之乙烯性不飽和基之寡聚物,則無特別限制可列舉例如具有乙烯基、烯丙基、(甲基)丙烯醯基等之寡聚物,宜為具有乙烯基之寡聚物。 另外,本說明書中,若歸屬於具有乙烯性不飽和基之寡聚物的化合物,且亦歸屬於含有2個以上之碳-碳不飽和雙鍵之聚苯醚化合物的化合物,則歸為含有2個以上之碳-碳不飽和雙鍵之聚苯醚化合物。 具有乙烯性不飽和基之寡聚物宜為苯乙烯寡聚物。本實施形態相關之苯乙烯寡聚物宜將選自由苯乙烯及上述苯乙烯衍生物、乙烯基甲苯構成之群組中之至少1種進行聚合而成。苯乙烯寡聚物的數目平均分子量宜為178以上,且宜為1600以下。又,苯乙烯寡聚物宜為平均芳香環數為2~14、芳香環數之2~14的總量為50質量%以上、且沸點為300℃以上之不具分支結構的化合物。 <Oligomers with ethylenically unsaturated groups> In the resin composition of this embodiment, in order to improve thermosetting properties and curing properties by active energy rays (for example, photocuring properties by ultraviolet rays), an oligomer having an ethylenically unsaturated group may be used in combination. The oligomer having an ethylenically unsaturated group used in this embodiment is not particularly limited as long as it is an oligomer having one or more ethylenically unsaturated groups per molecule. Examples include vinyl, allyl, etc. The oligomer containing a vinyl group, a (meth)acrylyl group, etc. is preferably an oligomer having a vinyl group. In addition, in this specification, if a compound is classified as an oligomer having an ethylenically unsaturated group and a compound is also classified as a polyphenylene ether compound containing two or more carbon-carbon unsaturated double bonds, it is classified as containing Polyphenylene ether compounds with more than 2 carbon-carbon unsaturated double bonds. The oligomer having an ethylenically unsaturated group is preferably a styrene oligomer. The styrene oligomer according to this embodiment is preferably obtained by polymerizing at least one selected from the group consisting of styrene, the above-mentioned styrene derivatives, and vinyl toluene. The number average molecular weight of the styrene oligomer is preferably 178 or more and 1,600 or less. In addition, the styrene oligomer is preferably a compound having an average aromatic ring number of 2 to 14, a total aromatic ring number of 2 to 14 of 50 mass % or more, and a boiling point of 300° C. or more without a branched structure.
本實施形態所使用的苯乙烯寡聚物可列舉例如:苯乙烯聚合物、乙烯基甲苯聚合物、α-甲基苯乙烯聚合物、乙烯基甲苯-α-甲基苯乙烯聚合物、苯乙烯-α-苯乙烯聚合物等。苯乙烯聚合物也可使用市售品,可列舉例如:Picolastic A5(Eastman Chemical公司製)、Picolastic A-75(Eastman Chemical公司製)、Piccotex 75(Eastman Chemical公司製)、FTR-8100(三井化學(股)製)、FTR-8120(三井化學(股)製)。又,乙烯基甲苯-α-甲基苯乙烯聚合物可列舉:Piccotex LC(Eastman Chemical公司製)。又,α-甲基苯乙烯聚合物可列舉:Crystalex 3070(Eastman Chemical公司製)、Crystalex 3085(Eastman Chemical公司製)、Crystalex (3100)、Crystalex 5140(Eastman Chemical公司製)、FMR-0100(三井化學(股)製)、FMR-0150(三井化學(股)製)。又,苯乙烯-α-苯乙烯聚合物可列舉:FTR-2120(三井化學(股)製)。這些苯乙烯寡聚物可單獨使用,也可合併使用2種以上。 本實施形態之樹脂組成物中,α-甲基苯乙烯寡聚物由於會良好地熱硬化,良好的微細配線之填埋性及焊料耐熱性、低相對介電常數、低介電損耗正切優良,故較理想。 Examples of the styrene oligomer used in this embodiment include styrene polymer, vinyltoluene polymer, α-methylstyrene polymer, vinyltoluene-α-methylstyrene polymer, styrene -α-styrene polymer, etc. Commercially available styrene polymers can also be used, and examples include Picolastic A5 (manufactured by Eastman Chemical Co., Ltd.), Picolastic A-75 (manufactured by Eastman Chemical Co., Ltd.), Piccotex 75 (manufactured by Eastman Chemical Co., Ltd.), and FTR-8100 (Mitsui Chemical Co., Ltd. (Co., Ltd.), FTR-8120 (Co., Ltd. Mitsui Chemicals Co., Ltd.). Examples of the vinyltoluene-α-methylstyrene polymer include Piccotex LC (manufactured by Eastman Chemical Co., Ltd.). Examples of α-methylstyrene polymers include Crystalex 3070 (manufactured by Eastman Chemical Co., Ltd.), Crystalex 3085 (manufactured by Eastman Chemical Co., Ltd.), Crystalex (3100), Crystalex 5140 (manufactured by Eastman Chemical Co., Ltd.), and FMR-0100 (Mitsui Chemical Co., Ltd.), FMR-0150 (Mitsui Chemical Co., Ltd.). Moreover, examples of the styrene-α-styrene polymer include FTR-2120 (manufactured by Mitsui Chemicals Co., Ltd.). These styrene oligomers may be used individually or in combination of 2 or more types. In the resin composition of this embodiment, the α-methylstyrene oligomer is excellent in thermal hardening, good embedding properties of fine wiring, solder heat resistance, low relative dielectric constant, and low dielectric loss tangent. Therefore it is more ideal.
本實施形態之樹脂組成物含有具有乙烯性不飽和基之寡聚物時,其含量相對於樹脂組成物中之樹脂固體成分100質量份,宜為0.5質量份以上,為1質量份以上更佳,為2質量份以上再更佳,為3質量份以上又更佳,此外,也可為5質量份以上。藉由設為前述下限值以上,會有更為改善得到的硬化物之低介電性的傾向。又,具有乙烯性不飽和基之寡聚物的含量之上限值相對於樹脂組成物中之樹脂固體成分100質量份,宜為30質量份以下,為25質量份以下更佳,為20質量份以下再更佳,為15質量份以下又更佳,為10質量份以下再更佳。藉由設為前述上限值以下,會有更為改善得到的硬化物之耐熱性的傾向。又,會有更為改善得到的硬化物之低介電常數性、低介電損耗正切性、及耐藥品性的傾向。 本實施形態之樹脂組成物中,可僅含1種具有乙烯性不飽和基之寡聚物,也可含有2種以上。含有2種以上時,合計量宜為上述範圍。 When the resin composition of this embodiment contains an oligomer having an ethylenically unsaturated group, its content is preferably 0.5 parts by mass or more, more preferably 1 part by mass or more, based on 100 parts by mass of the resin solid content in the resin composition. , more preferably 2 parts by mass or more, more preferably 3 parts by mass or more, and may be 5 parts by mass or more. By setting it to the lower limit value or more, the low dielectric property of the obtained hardened material tends to be further improved. Moreover, the upper limit of the content of the oligomer having an ethylenically unsaturated group is preferably 30 parts by mass or less, more preferably 25 parts by mass or less, based on 100 parts by mass of the resin solid content in the resin composition. More preferably, it is not more than 15 parts by mass, and still more preferably not more than 10 parts by mass. By setting it below the upper limit, the heat resistance of the obtained hardened material tends to be further improved. In addition, the low dielectric constant, low dielectric loss tangent, and chemical resistance of the obtained hardened material tend to be further improved. The resin composition of this embodiment may contain only one type of oligomer having an ethylenically unsaturated group, or may contain two or more types. When two or more types are contained, the total amount is preferably within the above range.
<熱塑性彈性體> 本實施形態之樹脂組成物也可含有熱塑性彈性體。 本實施形態中的熱塑性彈性體並無特別限制,可列舉例如選自由聚異戊二烯、聚丁二烯、苯乙烯丁二烯、丁基橡膠、乙烯丙烯橡膠、苯乙烯丁二烯乙烯、苯乙烯丁二烯苯乙烯、苯乙烯異戊二烯苯乙烯、苯乙烯乙烯丁烯苯乙烯、苯乙烯丙烯苯乙烯、苯乙烯乙烯丙烯苯乙烯、氟橡膠、聚矽氧橡膠、它們的氫化化合物、它們的烷基化合物、及它們的共聚物構成之群組中之至少1種。 <Thermoplastic elastomer> The resin composition of this embodiment may contain a thermoplastic elastomer. The thermoplastic elastomer in this embodiment is not particularly limited, and examples thereof include polyisoprene, polybutadiene, styrene butadiene, butyl rubber, ethylene propylene rubber, styrene butadiene, Styrene butadiene styrene, styrene isoprene styrene, styrene ethylene butylene styrene, styrene propylene styrene, styrene ethylene propylene styrene, fluorine rubber, silicone rubber, and their hydrogenated compounds , their alkyl compounds, and their copolymers.
本實施形態使用的熱塑性彈性體之數目平均分子量宜為5萬以上。藉由將數目平均分子量設為5萬以上,會有得到的硬化物之低介電特性(Dk及/或Df)更為優良的傾向。數目平均分子量宜為6萬以上,為7萬以上更佳,為8萬以上再更佳。熱塑性彈性體之數目平均分子量之上限宜為40萬以下,為35萬以下更佳,為30萬以下再更佳。藉由設為前述上限值以下,會有更為改善熱塑性彈性體成分對樹脂組成物之溶解性的傾向。 本實施形態之樹脂組成物含有2種以上之熱塑性彈性體時,它們的混合物之數目平均分子量宜符合上述範圍。 The number average molecular weight of the thermoplastic elastomer used in this embodiment is preferably 50,000 or more. By setting the number average molecular weight to 50,000 or more, the low dielectric properties (Dk and/or Df) of the obtained hardened material tend to be more excellent. The number average molecular weight is preferably 60,000 or more, more preferably 70,000 or more, and still more preferably 80,000 or more. The upper limit of the number average molecular weight of the thermoplastic elastomer is preferably 400,000 or less, more preferably 350,000 or less, and still more preferably 300,000 or less. By setting it below the upper limit, the solubility of the thermoplastic elastomer component in the resin composition tends to be further improved. When the resin composition of this embodiment contains two or more types of thermoplastic elastomers, the number average molecular weight of their mixture is preferably within the above range.
本實施形態中,熱塑性彈性體宜為含有苯乙烯單體單元及共軛二烯單體單元之熱塑性彈性體(以下稱「熱塑性彈性體(E)」)。藉由使用如此的熱塑性彈性體(E),得到的硬化物之低介電特性(Dk及/或Df)更為優良。In this embodiment, the thermoplastic elastomer is preferably a thermoplastic elastomer containing styrene monomer units and conjugated diene monomer units (hereinafter referred to as "thermoplastic elastomer (E)"). By using such a thermoplastic elastomer (E), the obtained hardened material has further excellent low dielectric properties (Dk and/or Df).
上述熱塑性彈性體(E)含有苯乙烯單體單元。藉由含有苯乙烯單體單元,會改善熱塑性彈性體(E)對樹脂組成物之溶解性。苯乙烯單體係例示苯乙烯、α-甲基苯乙烯、對甲基苯乙烯、二乙烯苯(乙烯基苯乙烯)、N,N-二甲基-對胺基乙基苯乙烯、N,N-二乙基-對胺基乙基苯乙烯等,它們之中,考慮取得性及生產性之觀點,宜為苯乙烯、α-甲基苯乙烯、對甲基苯乙烯。它們之中,為苯乙烯特佳。 上述熱塑性彈性體(E)中的苯乙烯單體單元的含量宜為全部單體單元的10~50質量%之範圍,為13~45質量%之範圍更佳,為15~40質量%之範圍再更佳。苯乙烯單體單元的含量若為50質量%以下,則和基材等之密合性、黏著性會變更良好。又,若為10質量%以上,則會有可抑制黏著強度上升,不易產生殘膠、停止痕跡(stop mark),且黏著面彼此之易剝離性良好的傾向,故較理想。 熱塑性彈性體(E)可僅含1種苯乙烯單體單元,也可含有2種以上。含有2種以上時,合計量宜為上述範圍。 本實施形態之熱塑性彈性體(E)中之苯乙烯單體單元的含量之測定方法可參酌國際公開第2017/126469號之記載,並將其內容納入本說明書。針對後述共軛二烯單體單元等亦同樣。 The above-mentioned thermoplastic elastomer (E) contains styrene monomer units. By containing styrene monomer units, the solubility of the thermoplastic elastomer (E) into the resin composition will be improved. Examples of styrene monosystem include styrene, α-methylstyrene, p-methylstyrene, divinylbenzene (vinylstyrene), N,N-dimethyl-p-aminoethylstyrene, N, N-diethyl-p-aminoethylstyrene, etc., among them, styrene, α-methylstyrene, and p-methylstyrene are preferred from the viewpoint of availability and productivity. Among them, styrene is particularly good. The content of the styrene monomer units in the thermoplastic elastomer (E) is preferably in the range of 10 to 50 mass% of all monomer units, more preferably in the range of 13 to 45 mass%, and in the range of 15 to 40 mass% Even better. If the content of the styrene monomer unit is 50% by mass or less, the adhesion and adhesion to the base material will be improved. In addition, if it is 10% by mass or more, the increase in adhesive strength is suppressed, adhesive residue and stop marks are less likely to occur, and the adhesion surfaces tend to be easily peelable from each other, so this is preferable. The thermoplastic elastomer (E) may contain only one type of styrene monomer unit, or may contain two or more types. When two or more types are contained, the total amount is preferably within the above range. The method for measuring the content of styrene monomer units in the thermoplastic elastomer (E) of this embodiment can be referred to the records in International Publication No. 2017/126469, and the content is incorporated into this specification. The same applies to the conjugated diene monomer units described below.
上述熱塑性彈性體(E)含有共軛二烯單體單元。藉由含有共軛二烯單體單元,會改善熱塑性彈性體(E)對樹脂組成物之溶解性。共軛二烯單體只要為具有1對共軛雙鍵之二烯烴,則無特別限制。共軛二烯單體可列舉例如:1,3-丁二烯、2-甲基-1,3-丁二烯(異戊二烯)、2,3-二甲基-1,3-丁二烯、1,3-戊二烯、2-甲基-1,3-戊二烯、1,3-己二烯、及菌綠烯(farnesene),宜為1,3-丁二烯、及異戊二烯,為1,3-丁二烯更佳。 熱塑性彈性體(E)可僅含1種共軛二烯單體單元,也可含有2種以上。 The above-mentioned thermoplastic elastomer (E) contains conjugated diene monomer units. By containing conjugated diene monomer units, the solubility of the thermoplastic elastomer (E) into the resin composition will be improved. The conjugated diene monomer is not particularly limited as long as it is a diene having one pair of conjugated double bonds. Examples of conjugated diene monomers include: 1,3-butadiene, 2-methyl-1,3-butadiene (isoprene), 2,3-dimethyl-1,3-butadiene Diene, 1,3-pentadiene, 2-methyl-1,3-pentadiene, 1,3-hexadiene, and bacteriogreen (farnesene), preferably 1,3-butadiene, and isoprene, preferably 1,3-butadiene. The thermoplastic elastomer (E) may contain only one type of conjugated diene monomer unit, or may contain two or more types.
上述熱塑性彈性體(E)中,苯乙烯單體單元和共軛二烯單體單元的質量比率,宜為苯乙烯單體單元/共軛二烯單體單元=5/95~80/20之範圍,為7/93~77/23之範圍更佳,為10/90~70/30之範圍再更佳。苯乙烯聚合物單元和共軛二烯單體單元的質量比率若為5/95~80/20之範圍,則可抑制黏著強度上升並維持高黏著力,且黏著面彼此之易剝離性良好。In the above-mentioned thermoplastic elastomer (E), the mass ratio of styrene monomer units and conjugated diene monomer units is preferably styrene monomer unit/conjugated diene monomer unit = 5/95 to 80/20. The range is preferably from 7/93 to 77/23, and the range from 10/90 to 70/30 is even better. If the mass ratio of styrene polymer units and conjugated diene monomer units is in the range of 5/95 to 80/20, an increase in adhesive strength can be suppressed and high adhesive force can be maintained, and the adhesive surfaces can be easily peeled off from each other.
上述熱塑性彈性體(E)中,熱塑性彈性體的共軛二烯鍵之全部可被氫化,也可一部分被氫化,亦可不被氫化。In the above-mentioned thermoplastic elastomer (E), all of the conjugated diene bonds of the thermoplastic elastomer may be hydrogenated, part of them may be hydrogenated, or they may not be hydrogenated.
上述熱塑性彈性體(E)中,除了含有苯乙烯單體單元及共軛二烯單體單元之外,也可含有其它單體單元,也可不含。其它單體單元係例示苯乙烯單體單元以外之芳香族乙烯基化合物單元等。 上述熱塑性彈性體(E)中,苯乙烯單體單元及共軛二烯單體單元的合計宜為全部單體單元的90質量%以上,為95質量%以上更佳,為97質量%以上再更佳,為99質量%以上又更佳。 如上所述,熱塑性彈性體(E)可分別僅含有1種苯乙烯單體單元及共軛二烯單體單元,也可含有2種以上。含有2種以上時,合計量宜為上述範圍。 The above-mentioned thermoplastic elastomer (E) may or may not contain other monomer units in addition to styrene monomer units and conjugated diene monomer units. Examples of other monomer units include aromatic vinyl compound units other than styrene monomer units. In the above-mentioned thermoplastic elastomer (E), the total of styrene monomer units and conjugated diene monomer units is preferably 90 mass% or more of all monomer units, more preferably 95 mass% or more, and still more 97 mass% or more. Even better, it is 99 mass % or more, and it is still better. As described above, the thermoplastic elastomer (E) may contain only one type of styrene monomer unit and conjugated diene monomer unit, or may contain two or more types. When two or more types are contained, the total amount is preferably within the above range.
本實施形態使用的熱塑性彈性體(E)也可為嵌段聚合物,亦可為無規聚合物。又,共軛二烯單體單元可為被氫化之氫化彈性體,也可為未被氫化之未氫化彈性體,亦可為一部分被氫化之部分氫化彈性體。 本實施形態之一實施形態中,熱塑性彈性體(E)為未氫化彈性體。 未氫化彈性體係指以彈性體中之共軛二烯單體單元為基準之雙鍵之中,被氫化的比例亦即加氫率(氫化率)為20%以下者。前述氫化率宜為15%以下,為10%以下更佳,為5%以下再更佳。 The thermoplastic elastomer (E) used in this embodiment may be a block polymer or a random polymer. In addition, the conjugated diene monomer unit may be a hydrogenated elastomer that is hydrogenated, an unhydrogenated elastomer that is not hydrogenated, or a partially hydrogenated elastomer that is partially hydrogenated. In one embodiment of this embodiment, the thermoplastic elastomer (E) is a non-hydrogenated elastomer. An unhydrogenated elastomer refers to one in which the proportion of double bonds that are hydrogenated based on the conjugated diene monomer units in the elastomer, that is, the hydrogenation rate (hydrogenation rate), is 20% or less. The aforementioned hydrogenation rate is preferably 15% or less, more preferably 10% or less, and still more preferably 5% or less.
本實施形態使用的熱塑性彈性體(E)之市售品係例示KURARAY股份有限公司製之SEPTON(註冊商標)2104、旭化成股份有限公司製之S.O.R.(註冊商標)S1606、S1613、S1609、S1605、JSR股份有限公司製之DYNARON(註冊商標)9901P、TR2250等。Examples of commercially available types of thermoplastic elastomer (E) used in this embodiment include SEPTON (registered trademark) 2104 manufactured by Kuraray Co., Ltd., S.O.R. (registered trademark) S1606, S1613, S1609, S1605, and JSR manufactured by Asahi Kasei Co., Ltd. DYNARON (registered trademark) 9901P, TR2250, etc., which are joint-stock companies.
本實施形態之樹脂組成物含有熱塑性彈性體(宜為熱塑性彈性體(E))時,其含量相對於樹脂固體成分100質量份,宜為1質量份以上,為5質量份以上更佳,為10質量份以上再更佳,也可為15質量份以上。藉由設為前述下限值以上,會有更為改善得到的硬化物之低介電特性(Dk及/或Df)的傾向。又,熱塑性彈性體的含量之上限值,相對於樹脂固體成分100質量份,宜為45質量份以下,為40質量份以下更佳,為35質量份以下再更佳,為30質量份以下又更佳,也可為25質量份以下。藉由設為前述上限值以下,會有更為改善得到的硬化物之耐熱性的傾向。 本實施形態之樹脂組成物可僅含1種熱塑性彈性體,也可含有2種以上。含有2種以上時,合計量宜為上述範圍。 When the resin composition of this embodiment contains a thermoplastic elastomer (preferably thermoplastic elastomer (E)), its content is preferably 1 part by mass or more, more preferably 5 parts by mass or more, based on 100 parts by mass of the resin solid content. More preferably, it is 10 parts by mass or more, and it may be 15 parts by mass or more. By setting it to the lower limit value or more, the low dielectric properties (Dk and/or Df) of the obtained hardened material tend to be further improved. In addition, the upper limit of the content of the thermoplastic elastomer is preferably 45 parts by mass or less, more preferably 40 parts by mass or less, more preferably 35 parts by mass or less, based on 100 parts by mass of the resin solid content. More preferably, it may be 25 parts by mass or less. By setting it below the upper limit, the heat resistance of the obtained hardened material tends to be further improved. The resin composition of this embodiment may contain only one type of thermoplastic elastomer, or may contain two or more types. When two or more types are contained, the total amount is preferably within the above range.
<阻燃劑> 本實施形態之樹脂組成物也可含有阻燃劑。阻燃劑係例示:磷系阻燃劑、鹵素系阻燃劑、無機系阻燃劑及聚矽氧系阻燃劑,宜為磷系阻燃劑。 阻燃劑可使用公知者,可列舉例如:溴化環氧樹脂、溴化聚碳酸酯、溴化聚苯乙烯、溴化苯乙烯、溴化酞醯亞胺、四溴雙酚A、(甲基)丙烯酸五溴苄酯、五溴甲苯、三溴苯酚、六溴苯、十溴二苯基醚、雙-1,2-五溴苯基乙烷、氯化聚苯乙烯、氯化石蠟等鹵素系阻燃劑;紅磷、磷酸三甲酚酯、磷酸三苯酯、磷酸甲酚基二苯酯、磷酸三(二甲苯酯)、磷酸三烷酯、磷酸二烷酯、磷酸參(氯乙酯)、膦氮烯、1,3-伸苯基雙(2,6-二(二甲苯基)磷酸酯)、10-(2,5-二羥基苯基)-10H-9-氧雜-10-磷雜菲-10-氧化物等磷系阻燃劑;氫氧化鋁、氫氧化鎂、部分軟水鋁石、軟水鋁石、硼酸鋅、三氧化銻等無機系阻燃劑;聚矽氧橡膠、聚矽氧樹脂等聚矽氧系阻燃劑。 本實施形態中,在它們之中,由於1,3-伸苯基雙(2,6-二(二甲苯基)磷酸酯)不會損及低介電特性(Dk及/或Df),故較理想。 <Flame retardant> The resin composition of this embodiment may also contain a flame retardant. Examples of flame retardants include phosphorus-based flame retardants, halogen-based flame retardants, inorganic-based flame retardants and polysiloxane-based flame retardants. Phosphorus-based flame retardants are preferred. Known flame retardants can be used, and examples include: brominated epoxy resin, brominated polycarbonate, brominated polystyrene, brominated styrene, brominated phthalamide, tetrabromobisphenol A, (methane base) Pentabromobenzyl acrylate, pentabromotoluene, tribromophenol, hexabromobenzene, decabromodiphenyl ether, bis-1,2-pentabromophenylethane, chlorinated polystyrene, chlorinated paraffin, etc. Halogen flame retardants; red phosphorus, tricresyl phosphate, triphenyl phosphate, cresyl diphenyl phosphate, tris(xylyl)phosphate, trialkyl phosphate, dialkyl phosphate, ethyl chloride ester), phosphine nitrogen, 1,3-phenylenebis(2,6-di(dylyl)phosphate), 10-(2,5-dihydroxyphenyl)-10H-9-oxa- Phosphorus flame retardants such as 10-phosphaphenanthrene-10-oxide; inorganic flame retardants such as aluminum hydroxide, magnesium hydroxide, part of boehmite, boehmite, zinc borate, antimony trioxide; polysiloxane Polysilicone flame retardants such as rubber and polysilicone resin. In this embodiment, among them, 1,3-phenylenebis(2,6-di(xylyl)phosphate) does not impair the low dielectric properties (Dk and/or Df). More ideal.
本實施形態之樹脂組成物含有阻燃劑時,其含量相對於樹脂組成物中之樹脂固體成分100質量份,宜為1質量份以上,為5質量份以上更佳,為10質量份以上再更佳,也可為15質量份以上。又,阻燃劑的含量之下限值宜為30質量份以下,為25質量份以下更佳。 阻燃劑可單獨使用1種或組合使用2種以上。使用2種以上時,合計量為上述範圍。 When the resin composition of this embodiment contains a flame retardant, its content is preferably 1 part by mass or more, more preferably 5 parts by mass or more, and 10 parts by mass or more based on 100 parts by mass of the resin solid content in the resin composition. More preferably, it may be 15 parts by mass or more. In addition, the lower limit of the content of the flame retardant is preferably 30 parts by mass or less, more preferably 25 parts by mass or less. A flame retardant can be used individually by 1 type or in combination of 2 or more types. When two or more types are used, the total amount shall be within the above range.
<活性酯化合物> 本實施形態之樹脂組成物中,在不損及本發明之效果的範圍內,也可含有活性酯化合物。活性酯化合物並無特別限制,例如可參酌國際公開第2021/172317號之段落0064~0066之記載,並將其內容納入本說明書。 <Active ester compound> The resin composition of this embodiment may contain an active ester compound within a range that does not impair the effects of the present invention. The active ester compound is not particularly limited. For example, the descriptions in paragraphs 0064 to 0066 of International Publication No. 2021/172317 can be referred to, and the content thereof is incorporated into this specification.
本實施形態之樹脂組成物含有活性酯化合物時,相對於樹脂組成物中之樹脂固體成分100質量份,宜為1質量份以上,且宜為50質量份以下。 本實施形態中的樹脂組成物中,可僅含1種活性酯化合物,也可含有2種以上。含有2種以上時,合計量宜為上述範圍。 又,本實施形態中的樹脂組成物也可設為實質上不含活性酯化合物之構成。實質上不含係指活性酯化合物的含量相對於樹脂組成物中之樹脂固體成分100質量份未達1質量份,宜為未達0.1質量份,為未達0.01質量份再更佳。 When the resin composition of this embodiment contains an active ester compound, it is preferably 1 part by mass or more and 50 parts by mass or less based on 100 parts by mass of the resin solid content in the resin composition. The resin composition in this embodiment may contain only one type of active ester compound, or may contain two or more types. When two or more types are contained, the total amount is preferably within the above range. Furthermore, the resin composition in this embodiment may be substantially free of active ester compounds. Substantially free means that the content of the active ester compound is less than 1 part by mass relative to 100 parts by mass of the resin solid content in the resin composition, preferably less than 0.1 part by mass, and more preferably less than 0.01 part by mass.
<分散劑> 本實施形態之樹脂組成物也可含有分散劑。分散劑可理想地使用通常塗料用途所使用者,其種類並無特別限制。分散劑宜使用共聚物基礎之濕潤分散劑,其具體例可列舉:BYK(股)製之DISPERBYK(註冊商標)-110、111、161、180、2009、2152、2155、BYK(註冊商標)-W996、W9010、W903、W940等。 <Dispersant> The resin composition of this embodiment may also contain a dispersant. As the dispersant, those used for general coating purposes can be ideally used, and the type thereof is not particularly limited. The dispersant should be a copolymer-based wetting dispersant. Specific examples include: DISPERBYK (registered trademark)-110, 111, 161, 180, 2009, 2152, 2155, BYK (registered trademark) manufactured by BYK Co., Ltd. W996, W9010, W903, W940, etc.
本實施形態之樹脂組成物含有分散劑時,其含量之下限值相對於樹脂組成物中之樹脂固體成分100質量份,宜為0.01質量份以上,為0.1質量份以上更佳,也可為0.3質量份以上。又,分散劑的含量之上限值相對於樹脂組成物中之樹脂固體成分100質量份,宜為10質量份以下,為5質量份以下更佳,也可為3質量份以下。 分散劑可單獨使用1種或組合使用2種以上。使用2種以上時,合計量為上述範圍。 When the resin composition of this embodiment contains a dispersant, the lower limit of its content is preferably 0.01 part by mass or more, more preferably 0.1 part by mass or more, based on 100 parts by mass of the resin solid content in the resin composition. It may also be 0.3 parts by mass or more. In addition, the upper limit of the content of the dispersant is preferably 10 parts by mass or less, more preferably 5 parts by mass or less, and may be 3 parts by mass or less based on 100 parts by mass of the resin solid content in the resin composition. A dispersant can be used individually by 1 type or in combination of 2 or more types. When two or more types are used, the total amount shall be within the above range.
<硬化促進劑> 本實施形態之樹脂組成物也可更含有硬化促進劑。硬化促進劑並無特別限制,可列舉例如:2-乙基-4-甲基咪唑、三苯基咪唑等咪唑類;過氧化苯甲醯、過氧化月桂醯、過氧化乙醯、對氯過氧化苯甲醯、二(三級丁基)-二-過苯二甲酸酯、α,α’-二(過氧化三級丁基)二異丙苯、2,5-二甲基-2,5-二(過氧化三級丁基)己烷、2,5-二甲基-2,5-雙(過氧化三級丁基)己-3-炔等有機過氧化物;偶氮雙腈等偶氮化合物;N,N-二甲基苄胺、N,N-二甲基苯胺、N,N-二甲基甲苯胺、2-N-乙苯胺基乙醇、三正丁胺、吡啶、喹啉、N-甲基𠰌啉、三乙醇胺、三伸乙二胺、四甲基丁二胺、N-甲基哌啶等三級胺類;苯酚、二甲酚、甲酚、間苯二酚、鄰苯二酚等酚類;2,3-二甲基-2,3-二苯基丁烷等高溫分解型自由基產生劑;環烷酸鉛、硬脂酸鉛、環烷酸鋅、辛酸鋅、辛酸錳、油酸錫、馬來酸二丁基錫、環烷酸錳、環烷酸鈷、乙醯基丙酮鐵等有機金屬鹽;將這些有機金屬鹽溶解於苯酚、雙酚等含羥基之化合物而成者;氯化錫、氯化鋅、氯化鋁等無機金屬鹽;氧化二辛基錫、其它烷基錫、烷基錫氧化物等有機錫化合物等。 理想的硬化促進劑為咪唑類及有機金屬鹽,組合使用咪唑類及有機金屬鹽之兩者更佳。 <Harding accelerator> The resin composition of this embodiment may further contain a hardening accelerator. The hardening accelerator is not particularly limited, and examples thereof include imidazoles such as 2-ethyl-4-methylimidazole and triphenylimidazole; benzoyl peroxide, lauryl peroxide, acetyl peroxide, and p-chloroperoxide. Benzyl oxide, di(tertiary butyl)-di-perphthalate, α,α'-di(tertiary butyl peroxide) dicumyl, 2,5-dimethyl-2 , 5-di(tertiary butyl peroxide) hexane, 2,5-dimethyl-2,5-bis(tertiary butyl peroxide) hexane-3-yne and other organic peroxides; azobis Azo compounds such as nitriles; N,N-dimethylbenzylamine, N,N-dimethylaniline, N,N-dimethyltoluidine, 2-N-ethylanilinoethanol, tri-n-butylamine, pyridine , quinoline, N-methyl𠰌line, triethanolamine, triethylenediamine, tetramethylbutylenediamine, N-methylpiperidine and other tertiary amines; phenol, xylenol, cresol, m-phenylene Phenols such as diphenols and catechol; high temperature decomposition free radical generators such as 2,3-dimethyl-2,3-diphenylbutane; lead naphthenate, lead stearate, naphthenic acid Zinc, zinc octoate, manganese octoate, tin oleate, dibutyltin maleate, manganese naphthenate, cobalt naphthenate, iron acetyl acetonate and other organic metal salts; dissolve these organic metal salts in phenol, bisphenol, etc. Compounds containing hydroxyl groups; inorganic metal salts such as tin chloride, zinc chloride, aluminum chloride; organic tin compounds such as dioctyltin oxide, other alkyltin, alkyltin oxides, etc. Ideal hardening accelerators are imidazoles and organometallic salts, and a combination of imidazoles and organometallic salts is more preferred.
本實施形態之樹脂組成物含有硬化促進劑時,其含量之下限值相對於樹脂組成物中之樹脂固體成分100質量份,宜為0.005質量份以上,為0.01質量份以上更佳,為0.1質量份以上再更佳。又,硬化促進劑的含量之上限值相對於樹脂組成物中之樹脂固體成分100質量份,宜為10質量份以下,為5質量份以下更佳,為2質量份以下再更佳。 硬化促進劑可單獨使用1種或組合使用2種以上。使用2種以上時,合計量為上述範圍。 When the resin composition of this embodiment contains a hardening accelerator, the lower limit of its content is preferably 0.005 parts by mass or more, more preferably 0.01 parts by mass or more, based on 100 parts by mass of the resin solid content in the resin composition. Quality parts and above are better. Furthermore, the upper limit of the content of the hardening accelerator is preferably 10 parts by mass or less, more preferably 5 parts by mass or less, and still more preferably 2 parts by mass or less based on 100 parts by mass of the resin solid content in the resin composition. The hardening accelerator can be used individually by 1 type or in combination of 2 or more types. When two or more types are used, the total amount shall be within the above range.
<溶劑> 本實施形態之樹脂組成物也可含有溶劑,宜含有有機溶劑。含有溶劑時,本實施形態之樹脂組成物宜為上述各種樹脂固體成分中之至少一部分且宜為全部會溶解於溶劑或相容於溶劑之形態(溶液或清漆)。溶劑若為可將上述各種樹脂固體成分中之至少一部分且宜為全部進行溶解或可相容之極性有機溶劑或無極性有機溶劑,則無特別限制,極性有機溶劑可列舉例如:酮類(例如丙酮、甲乙酮、甲基異丁基酮等)、賽璐蘇類(例如丙二醇單甲醚、丙二醇單甲醚乙酸酯等)、酯類(例如乳酸乙酯、乙酸甲酯、乙酸乙酯、乙酸丁酯、乙酸異戊酯、乳酸乙酯、甲氧基丙酸甲酯、羥基異丁酸甲酯等)、醯胺類(例如二甲氧基乙醯胺、二甲基甲醯胺類等),無極性有機溶劑可列舉:芳香族烴(例如甲苯、二甲苯等)。 溶劑可單獨使用1種或組合使用2種以上。使用2種以上時,合計量為上述範圍。 <Solvent> The resin composition of this embodiment may also contain a solvent, and preferably contains an organic solvent. When a solvent is contained, the resin composition of this embodiment is preferably in a form (solution or varnish) in which at least part and all of the above-mentioned various resin solid contents are dissolved or compatible with the solvent. The solvent is not particularly limited as long as it is a polar organic solvent or a non-polar organic solvent that can dissolve or be compatible with at least part and preferably all of the solid components of the various resins mentioned above. Examples of the polar organic solvent include ketones (such as Acetone, methyl ethyl ketone, methyl isobutyl ketone, etc.), cellulosides (such as propylene glycol monomethyl ether, propylene glycol monomethyl ether acetate, etc.), esters (such as ethyl lactate, methyl acetate, ethyl acetate, Butyl acetate, isoamyl acetate, ethyl lactate, methyl methoxypropionate, methyl hydroxyisobutyrate, etc.), amides (such as dimethoxyacetamide, dimethylformamide) etc.), non-polar organic solvents include aromatic hydrocarbons (such as toluene, xylene, etc.). A solvent can be used individually by 1 type or in combination of 2 or more types. When two or more types are used, the total amount shall be within the above range.
<其它成分> 本實施形態之樹脂組成物除了含有上述成分之外,也可含有熱塑性樹脂及其寡聚物等各種高分子化合物、各種添加劑。添加劑可列舉:紫外線吸收劑、抗氧化劑、光聚合起始劑、螢光增白劑、光敏劑、染料、顏料、增黏劑、流動調整劑、潤滑劑、消泡劑、整平劑、亮光劑、聚合抑制劑等。這些添加劑可單獨使用1種或組合使用2種以上。 <Other ingredients> In addition to the above-mentioned components, the resin composition of this embodiment may also contain various polymer compounds such as thermoplastic resins and oligomers thereof, and various additives. Additives can be listed: ultraviolet absorbers, antioxidants, photopolymerization initiators, fluorescent whitening agents, photosensitizers, dyes, pigments, tackifiers, flow regulators, lubricants, defoaming agents, leveling agents, brighteners agents, polymerization inhibitors, etc. These additives can be used individually by 1 type or in combination of 2 or more types.
<用途> 本實施形態之樹脂組成物能製成硬化物來使用。具體而言,本實施形態之樹脂組成物可理想地使用作為低相對介電常數材料及/或低介電損耗正切材料,且可理想地使用作為印刷配線板之絕緣層、半導體包裝體用材料等,並可理想地使用作為電子材料用樹脂組成物。本實施形態之樹脂組成物可理想地使用作為預浸體、使用預浸體之覆金屬箔疊層板、樹脂複合片、及印刷配線板用之材料。 <Use> The resin composition of this embodiment can be used as a cured product. Specifically, the resin composition of this embodiment can be suitably used as a low relative dielectric constant material and/or a low dielectric loss tangent material, and can be suitably used as an insulating layer of a printed wiring board or a material for a semiconductor package. etc., and can be ideally used as a resin composition for electronic materials. The resin composition of this embodiment can be suitably used as a material for prepregs, metal foil-clad laminates using prepregs, resin composite sheets, and printed wiring boards.
本實施形態之樹脂組成物成形厚度0.8mm的硬化板時之相對介電常數(Dk)宜低。具體而言,依循共振腔擾動法測得的在頻率10GHz時的相對介電常數(Dk)宜為2.60以下,為2.50以下更佳。相對介電常數(Dk)之下限值並無特別限制,但例如為0.01以上較實際。 又,本實施形態之樹脂組成物成形厚度0.8mm的硬化板時之介電損耗正切(Df)宜低。具體而言,依循共振腔擾動法測得的在頻率10GHz時之介電損耗正切(Df)宜為0.0020以下,為0.0018以下更佳,為0.0014以下再更佳。針對介電損耗正切(Df)之下限值並無特別限制,例如為0.0001以上較實際。 如此的低介電特性(Dk及/或Df)係藉由主要使用具有式(V)表示之構成單元的聚合物(V)及式(M1)表示之化合物(M1)來達成。 上述硬化板之相對介電常數(Dk)及介電損耗正切(Df),更具體係以後述實施例所記載之方法進行測定。 The resin composition of this embodiment should preferably have a low relative dielectric constant (Dk) when molded into a hardened plate with a thickness of 0.8 mm. Specifically, the relative dielectric constant (Dk) measured by the resonant cavity perturbation method at a frequency of 10 GHz is preferably 2.60 or less, and more preferably 2.50 or less. The lower limit of the relative dielectric constant (Dk) is not particularly limited, but it is practical to set it to 0.01 or more, for example. Furthermore, the resin composition of this embodiment should preferably have a low dielectric loss tangent (Df) when molded into a hardened plate with a thickness of 0.8 mm. Specifically, the dielectric loss tangent (Df) measured by the resonant cavity perturbation method at a frequency of 10 GHz should be less than 0.0020, preferably less than 0.0018, and even more preferably less than 0.0014. There is no particular restriction on the lower limit value of the dielectric loss tangent (Df). For example, it is more practical to set the lower limit value to 0.0001 or more. Such low dielectric properties (Dk and/or Df) are achieved by mainly using the polymer (V) having the structural unit represented by the formula (V) and the compound (M1) represented by the formula (M1). The relative dielectric constant (Dk) and dielectric loss tangent (Df) of the above-mentioned hardened plate were measured more systematically by the method described in the following examples.
本實施形態之樹脂組成物的硬化物依循DMA(動態機械測定)之玻璃轉移溫度宜為230℃以上,為250℃以上更佳。如此的高玻璃轉移溫度主要係藉由使用式(M)表示之化合物(M)來達成。玻璃轉移溫度之上限值,例如為350℃以下較實際。玻璃轉移溫度更具體而言,係以後述實施例所記載之方法進行測定。The glass transition temperature of the hardened product of the resin composition of this embodiment according to DMA (Dynamic Mechanical Measurement) is preferably 230°C or higher, more preferably 250°C or higher. Such a high glass transition temperature is mainly achieved by using the compound (M) represented by the formula (M). The upper limit of the glass transition temperature is, for example, 350°C or less. More specifically, the glass transition temperature is measured by the method described in the examples below.
又,使用本實施形態之樹脂組成物而得的絕緣層中,常會施以開孔加工,除膠渣耐性優良較理想。亦即,在開孔加工後之膠渣去除時,抑制絕緣層的劣化同時膠渣的去除性優良較理想。具體而言,將本實施形態之樹脂組成物成形厚度0.8mm的硬化板時之除膠渣試驗中的質量減少率,宜為-4.0質量%~-2.0質量%之範圍。除膠渣耐性係依循後述實施例之記載進行測定。In addition, the insulating layer obtained by using the resin composition of this embodiment is often subjected to drilling processing, and it is preferable to have excellent slag removal resistance. That is, when removing slag after drilling, it is ideal to suppress the deterioration of the insulating layer and to have excellent slag removal properties. Specifically, the mass reduction rate in the desmear test when the resin composition of this embodiment is formed into a hardened plate with a thickness of 0.8 mm is preferably in the range of -4.0 mass% to -2.0 mass%. The desmear resistance was measured according to the description of the Examples mentioned later.
本實施形態之樹脂組成物可使用作為成為印刷配線板之絕緣層的預浸體、樹脂複合片等之層狀(包含薄膜狀、片狀等之概念)材料,製成該層狀之材料時,其厚度宜為5μm以上,為10μm以上更佳。厚度之上限值宜為200μm以下,為180μm以下更佳。另外,上述層狀之材料的厚度,例如使本實施形態之樹脂組成物含浸於玻璃布等時,意指包含玻璃布之厚度。 由本實施形態之樹脂組成物形成的材料,可用於進行曝光顯影並形成圖案之用途,也可用於不進行曝光顯影之用途。尤其適於不進行曝光顯影之用途。 The resin composition of this embodiment can be made into a layered material (including concepts such as film form, sheet form, etc.) such as a prepreg or a resin composite sheet that serves as an insulating layer of a printed wiring board. , its thickness should be more than 5 μm, preferably more than 10 μm. The upper limit of the thickness is preferably 200 μm or less, more preferably 180 μm or less. In addition, the thickness of the above-mentioned layered material means including the thickness of the glass cloth when, for example, the resin composition of the present embodiment is impregnated with glass cloth. The material made of the resin composition of this embodiment can be used for pattern formation by exposure and development, or can be used without exposure and development. Especially suitable for applications where exposure and development are not required.
<<預浸體>> 本實施形態之預浸體係由基材(預浸體基材)及本實施形態之樹脂組成物形成。本實施形態之預浸體例如可藉由將本實施形態之樹脂組成物使用(例如含浸及/或塗佈)於基材後,利用加熱(例如以120~220℃使其乾燥2~15分鐘之方法等)使其半硬化來獲得。此時,樹脂組成物對於基材之附著量,亦即樹脂組成物量(包含填充材(D))相對於半硬化後之預浸體的總量宜為20~99質量%之範圍,為20~80質量%之範圍更佳。 <<Prepreg>> The prepreg system of this embodiment is formed from a base material (prepreg base material) and the resin composition of this embodiment. The prepreg of this embodiment can be made by applying (for example, impregnating and/or coating) the resin composition of this embodiment to a base material, and then drying it by heating (for example, at 120 to 220° C. for 2 to 15 minutes). method, etc.) to semi-harden it. At this time, the adhesion amount of the resin composition to the base material, that is, the amount of the resin composition (including the filler (D)) relative to the total amount of the semi-hardened prepreg, is preferably in the range of 20 to 99 mass %, which is 20 The range of ~80 mass% is more preferable.
基材若為各種印刷配線板材料所使用的基材,則無特別限制。基材之材質可列舉例如:玻璃纖維(例如E-玻璃、D-玻璃、L-玻璃、S-玻璃、T-玻璃、Q-玻璃、UN-玻璃、NE-玻璃、球狀玻璃等)、玻璃以外的無機纖維(例如石英等)、有機纖維(例如聚醯亞胺、聚醯胺、聚酯、液晶聚酯、聚四氟乙烯等)。基材的形態並無特別限制,可列舉織布:不織布、粗紗、切股氈、表面加工氈等。這些基材可單獨使用,也可合併使用2種以上。這些基材之中,考慮尺寸安定性之觀點,宜為已施以超開纖處理、填孔處理之織布,考慮強度及低吸水性之觀點,宜為基材之厚度200μm以下、質量250g/m 2以下之玻璃織布,考慮吸濕耐熱性之觀點,宜為利用環氧矽烷、胺基矽烷等矽烷偶聯劑等進行表面處理後之玻璃織布。考慮電特性之觀點,為由L-玻璃、NE-玻璃、Q-玻璃等展現低相對介電常數、低介電損耗正切之玻璃纖維構成的低介電玻璃布更佳。 低相對介電常數性的基材例如例示相對介電常數為5.0以下(宜為3.0~4.9)之基材。低介電損耗正切性的基材例如例示介電損耗正切為0.006以下(宜為0.001~0.005)之基材。相對介電常數及介電損耗正切採利用擾動法空腔諧振器以頻率10GHz測得的值。 The base material is not particularly limited as long as it is a base material used for various printed wiring board materials. Examples of the material of the substrate include: glass fiber (such as E-glass, D-glass, L-glass, S-glass, T-glass, Q-glass, UN-glass, NE-glass, spherical glass, etc.), Inorganic fibers other than glass (such as quartz, etc.), organic fibers (such as polyimide, polyamide, polyester, liquid crystal polyester, polytetrafluoroethylene, etc.). The form of the base material is not particularly limited, and examples include woven fabrics: nonwoven fabrics, rovings, cut-strand felts, surface-processed felts, etc. These base materials may be used alone, or two or more types may be used in combination. Among these base materials, from the viewpoint of dimensional stability, it is preferable to use a fabric that has been subjected to ultra-fiber opening treatment and hole filling treatment. From the viewpoint of strength and low water absorption, the thickness of the base material is preferably 200 μm or less and the mass is 250 g. / m2 or less, from the viewpoint of moisture absorption and heat resistance, glass fabrics that have been surface-treated with silane coupling agents such as epoxy silane and aminosilane are preferred. From the viewpoint of electrical properties, low-dielectric glass cloth composed of glass fibers that exhibit low relative permittivity and low dielectric loss tangent, such as L-glass, NE-glass, and Q-glass, is better. Examples of the base material with low relative dielectric constant include a base material with a relative dielectric constant of 5.0 or less (preferably 3.0 to 4.9). Examples of the base material with low dielectric loss tangent include a base material with a dielectric loss tangent of 0.006 or less (preferably 0.001 to 0.005). The relative dielectric constant and dielectric loss tangent are measured using a perturbation method cavity resonator at a frequency of 10 GHz.
<<覆金屬箔疊層板>> 本實施形態之覆金屬箔疊層板含有由本實施形態之預浸體形成之至少1層、及配置於由前述預浸體形成之層的單面或雙面之金屬箔。本實施形態之覆金屬箔疊層板之製作方法可列舉例如配置至少1片(宜為重疊2片以上)之本實施形態之預浸體,並於其單面或雙面配置金屬箔後進行疊層成形之方法。更詳細而言,可藉由在預浸體之單面或雙面配置銅、鋁等金屬箔並進行疊層成形來製作。預浸體的片數宜為1~10片,為2~10片更佳,為2~9片再更佳。 金屬箔若為印刷配線板用材料所使用者。則無特別限制,可列舉例如:壓延銅箔、電解銅箔等銅箔。金屬箔(宜為銅箔)之厚度並無特別限制,也可為約1.5~70μm。又,使用銅箔作為金屬箔時,銅箔宜調整為依循JIS B0601:2013進行測定之銅箔表面的粗糙度Rz為0.2~4.0μm。藉由將銅箔表面的粗糙度Rz調整為0.2μm以上,會有銅箔表面之粗糙度成為適當的大小,且更為改善銅箔剝離強度的傾向。另一方面,藉由將銅箔表面的粗糙度Rz調整為4.0μm以下,會有銅箔表面之粗糙度成為適當的大小,且更為改善得到的硬化物之介電損耗正切特性的傾向。銅箔表面的粗糙度Rz,考慮減少介電損耗正切之觀點,為0.5μm以上更佳,為0.6μm以上再更佳,為0.7μm以上特佳,又,為3.5μm以下更佳,為3.0μm以下再更佳,為2.0μm以下特佳。 <<Metal foil clad laminate>> The metal foil-clad laminate of this embodiment includes at least one layer made of the prepreg of this embodiment, and one-sided or double-sided metal foil arranged on the layer made of the prepreg. Examples of methods for producing the metal foil-clad laminate of this embodiment include arranging at least one piece (preferably two or more pieces) of the prepreg of this embodiment, and arranging metal foil on one or both sides of the prepreg. Layer forming method. More specifically, it can be produced by arranging metal foils such as copper and aluminum on one or both sides of the prepreg and performing lamination molding. The number of prepreg sheets is preferably 1 to 10 sheets, more preferably 2 to 10 sheets, and even more preferably 2 to 9 sheets. If metal foil is used as a material for printed wiring boards. There are no particular restrictions, and examples thereof include copper foils such as rolled copper foil and electrolytic copper foil. The thickness of the metal foil (preferably copper foil) is not particularly limited, and may be about 1.5 to 70 μm. In addition, when copper foil is used as the metal foil, the copper foil should be adjusted so that the surface roughness Rz of the copper foil measured in accordance with JIS B0601:2013 is 0.2 to 4.0 μm. By adjusting the roughness Rz of the copper foil surface to 0.2 μm or more, the roughness of the copper foil surface becomes an appropriate size, and the copper foil peeling strength tends to be further improved. On the other hand, by adjusting the roughness Rz of the copper foil surface to 4.0 μm or less, the roughness of the copper foil surface becomes an appropriate size, and the dielectric loss tangent characteristics of the obtained hardened material tend to be further improved. The roughness Rz of the copper foil surface, from the viewpoint of reducing the dielectric loss tangent, is preferably 0.5 μm or more, more preferably 0.6 μm or more, particularly preferably 0.7 μm or more, and 3.5 μm or less, more preferably 3.0 A thickness of µm or less is more preferably 2.0 µm or less.
疊層成形的方法可列舉成形印刷配線板用疊層板及多層板時通常使用的方法,更詳細可列舉使用多層壓製機、多層真空壓製機、連續成形機、高溫高壓(autoclave)成形機等,以溫度約180~350℃、加熱時間約100~300分鐘、面壓約20~100kg/cm 2進行疊層成形之方法。又,也可藉由將本實施形態之預浸體和另外製作的內層用之配線板組合並進行疊層成形來製成多層板。多層板之製造方法例如可藉由在本實施形態之預浸體1片之雙面配置約35μm之銅箔,利用上述成形方法進行疊層形成後,形成內層電路,對該電路施以黑化處理來形成內層電路板,其後,將該內層電路板及本實施形態之預浸體交替逐片配置,再於最外層配置銅箔,並利用上述條件宜在真空下進行疊層成形來製作多層板。本實施形態之覆金屬箔疊層板可理想地使用作為印刷配線板。 The method of laminate molding includes methods commonly used when molding laminated boards and multilayer boards for printed wiring boards. More specific examples include the use of a multilayer press, a multilayer vacuum press, a continuous forming machine, a high-temperature and high-pressure (autoclave) forming machine, etc. , a method of laminate forming at a temperature of about 180 to 350°C, a heating time of about 100 to 300 minutes, and a surface pressure of about 20 to 100kg/ cm2 . In addition, a multilayer board can also be produced by combining the prepreg of this embodiment with a separately produced wiring board for the inner layer and performing lamination molding. The multilayer board can be manufactured, for example, by arranging approximately 35 μm copper foil on both sides of one prepreg of this embodiment, laminating it using the above-mentioned molding method, forming an inner layer circuit, and applying black coating to the circuit. chemical treatment to form an inner circuit board, and then alternately arrange the inner circuit board and the prepreg of this embodiment one by one, and then arrange the copper foil on the outermost layer, and use the above conditions to laminate it preferably under vacuum. Shaping to make multilayer boards. The metal foil-clad laminated board of this embodiment can be ideally used as a printed wiring board.
本實施形態之覆金屬箔疊層板依據JIS C6481之5.7「剝離強度」之規定所測得的剝離強度宜為0.28kN/m以上,為0.38kN/m以上更佳,為0.50kN/m以上再更佳。剝離強度之上限並無特別限制,例如為2.00kN/m以上。 剝離強度係依循後述實施例之記載進行測定。 The peel strength of the metal foil-clad laminate of this embodiment measured according to the provisions of JIS C6481 5.7 "Peel Strength" is preferably 0.28kN/m or more, more preferably 0.38kN/m or more, and 0.50kN/m or more. Even better. The upper limit of the peel strength is not particularly limited, but is, for example, 2.00 kN/m or more. The peel strength was measured according to the description of the Examples mentioned later.
如上所述,使用本實施形態之樹脂組成物(由特定成分之組合構成的樹脂組成物)而得的電子材料用樹脂組成物,可製成其硬化物具有低介電特性(低介電常數、低介電損耗正切)、吸濕耐熱性,而且具有耐熱性、除膠渣耐性、金屬箔剝離強度、耐裂紋性、硬化物之外觀、低熱膨脹性優良的特性者。As described above, the resin composition for electronic materials obtained by using the resin composition of this embodiment (a resin composition composed of a combination of specific components) can be made into a cured product having low dielectric properties (low dielectric constant). , low dielectric loss tangent), moisture absorption and heat resistance, and has excellent characteristics of heat resistance, slag removal resistance, metal foil peeling strength, crack resistance, hardened appearance, and low thermal expansion.
<<印刷配線板>> 本實施形態之印刷配線板係含有絕緣層、及配置於前述絕緣層之表面的導體層之印刷配線板,且前述絕緣層含有由本實施形態之樹脂組成物形成之層及由本實施形態之預浸體形成之層中之至少一者。如此的印刷配線板可依循常用方法來製造,其製造方法並無特別限制。以下例示印刷配線板之製造方法之一例。首先,準備上述覆銅箔疊層板等覆金屬箔疊層板。然後,對覆金屬箔疊層板之表面施以蝕刻處理來實施內層電路之形成,並製作內層基板。對該內層基板之內層電路表面因應需要時施用以提高黏接強度之表面處理,然後於其內層電路表面重疊所需片數之上述預浸體,再於其外側疊層外層電路用之金屬箔,再進行加熱加壓而成行為一體。以此方式製造在內層電路與外層電路用的金屬箔之間形成有由基材及樹脂組成物之硬化物構成的絕緣層之多層疊層板。然後,對該多層之疊層板施以通孔、導孔用之開孔加工後,於該孔之壁面形成使內層電路與外層電路用之金屬箔導通之鍍敷金屬皮膜,再對外層電路用之金屬箔施以蝕刻處理來形成外層電路,藉此製造印刷配線板。 <<Printed wiring board>> The printed wiring board of this embodiment is a printed wiring board including an insulating layer and a conductor layer arranged on the surface of the insulating layer, and the insulating layer includes a layer formed of the resin composition of this embodiment and a prepreg of this embodiment. At least one of the layers of body formation. Such a printed wiring board can be manufactured according to common methods, and the manufacturing method is not particularly limited. An example of a manufacturing method of a printed wiring board is illustrated below. First, a metal foil-clad laminate such as the above-mentioned copper foil laminate is prepared. Then, etching is performed on the surface of the metal foil-clad laminate to form an inner circuit, and an inner substrate is produced. The inner circuit surface of the inner substrate is subjected to surface treatment to improve the bonding strength when necessary, and then a required number of the above-mentioned prepregs are stacked on the inner circuit surface, and then the outer circuit is laminated on the outside. The metal foil is then heated and pressed to form a single piece. In this manner, a multilayer laminate is produced in which an insulating layer composed of a base material and a cured product of a resin composition is formed between the inner circuit and the metal foil for the outer circuit. Then, the multi-layer laminate board is subjected to drilling processing for through holes and guide holes, and a plated metal film is formed on the wall surface of the hole to conduct the metal foil for the inner circuit and the outer circuit, and then the outer layer is Printed wiring boards are manufactured by etching metal foil used for circuits to form outer circuits.
上述之製造例獲得的印刷配線板係具有絕緣層、及形成於該絕緣層之表面的導體層,且絕緣層包含上述本實施形態之樹脂組成物及/或其硬化物之構成。亦即,上述本實施形態之預浸體(例如由基材及含浸或塗佈於其之本實施形態之樹脂組成物形成的預浸體)、上述由本實施形態之覆金屬箔疊層板的樹脂組成物形成的層會成為本實施形態之絕緣層。 又,本實施形態亦關於含有前述印刷配線板之半導體裝置。半導體裝置的詳細內容可參酌日本特開2021-021027號公報之段落0200~0202之記載,並將這些內容納入本說明書中。 The printed wiring board obtained in the above production example has an insulating layer and a conductor layer formed on the surface of the insulating layer, and the insulating layer is composed of the resin composition of the present embodiment and/or its hardened product. That is, the above-mentioned prepreg of the present embodiment (for example, a prepreg formed of a base material and the resin composition of the present embodiment impregnated or coated thereon), the above-mentioned metal foil-clad laminate of the present embodiment. The layer formed of the resin composition serves as the insulating layer in this embodiment. Furthermore, this embodiment also relates to a semiconductor device including the printed wiring board. For details of the semiconductor device, reference can be made to the descriptions in paragraphs 0200 to 0202 of Japanese Patent Application Laid-Open No. 2021-021027, and these contents are incorporated into this specification.
又,以本實施形態之樹脂組成物的硬化物形成之絕緣層,宜將該其絕緣層之粗糙化處理後的表面粗糙度減小。具體而言,粗糙化處理後之絕緣層的表面之算術平均粗糙度Ra宜為200nm以下,為150nm以下更佳,為100nm以下特佳。算術平均粗糙度Ra之下限值並無特別限制,例如可為10nm以上。絕緣層的表面之算術平均粗糙度Ra的測定係使用非接觸型表面粗糙度計,以VSI模式,使用50倍透鏡進行測定來求得。 非接觸型表面粗糙度計使用Veeco Instruments公司製WYKONT3300。 Furthermore, it is preferable that the surface roughness of the insulating layer formed of the cured product of the resin composition of this embodiment be reduced after the roughening treatment. Specifically, the arithmetic mean roughness Ra of the surface of the insulating layer after roughening is preferably 200 nm or less, more preferably 150 nm or less, particularly preferably 100 nm or less. The lower limit of the arithmetic mean roughness Ra is not particularly limited, but may be 10 nm or more, for example. The arithmetic mean roughness Ra of the surface of the insulating layer is measured using a non-contact surface roughness meter in VSI mode using a 50x lens. As a non-contact surface roughness meter, WYKONT3300 manufactured by Veeco Instruments was used.
<<樹脂複合片>> 本實施形態之樹脂複合片含有支持體、及配置於前述支持體的表面之由本實施形態之樹脂組成物形成之層。樹脂複合片可使用作為堆積用薄膜或乾式薄膜阻焊劑。樹脂複合片之製造方法並無特別限制,可列舉例如藉由將上述本實施形態之樹脂組成物溶解於溶劑而成的溶液塗佈(塗覆)於支持體並進行乾燥來獲得樹脂複合片之方法。 <<Resin composite sheet>> The resin composite sheet of this embodiment includes a support and a layer formed of the resin composition of this embodiment arranged on the surface of the support. Resin composite sheets can be used as build-up films or dry film solder resists. The manufacturing method of the resin composite sheet is not particularly limited. For example, a solution obtained by dissolving the resin composition of the present embodiment in a solvent is applied to a support and dried to obtain a resin composite sheet. method.
在此使用的支持體可列舉例如:聚乙烯薄膜、聚丙烯薄膜、聚碳酸酯薄膜、聚對苯二甲酸乙二酯薄膜、乙烯四氟乙烯共聚物薄膜、以及於這些薄膜的表面塗佈脫模劑而成的脫模薄膜、聚醯亞胺薄膜等有機系之薄膜基材、銅箔、鋁箔等導體箔、玻璃板、SUS(Steel Use Stainless)板、FRP(Fiber-Reinforced Plastics)等板狀者,並無特別限制。Examples of the support used here include polyethylene film, polypropylene film, polycarbonate film, polyethylene terephthalate film, ethylene tetrafluoroethylene copolymer film, and coating strips on the surface of these films. Release films made of molding agents, organic film substrates such as polyimide films, conductor foils such as copper foil and aluminum foil, glass plates, SUS (Steel Use Stainless) plates, FRP (Fiber-Reinforced Plastics) and other plates There are no special restrictions for those who have the status.
塗佈方法(塗覆方法)可列舉例如將使本實施形態之樹脂組成物溶解於溶劑而成的溶液,以塗佈棒、模塗機、刮刀、貝克塗敷機(Baker applicator)等塗佈於支持體上之方法。又,也可藉由在乾燥後,從由支持體及樹脂組成物疊層而成的樹脂複合片將支持體剝離或進行蝕刻來製成單層片。另外,也可藉由將使上述本實施形態之樹脂組成物溶解於溶劑而成的溶液,供給於具有片狀之模槽的模具內並進行乾燥等而形成片狀,而不使用支持體來獲得單層片。Examples of the coating method (coating method) include a solution in which the resin composition of the present embodiment is dissolved in a solvent, and coating with a coating bar, die coater, doctor blade, Baker applicator, etc. method on the support. Alternatively, a single-layer sheet may be produced by peeling off the support or etching the resin composite sheet in which the support and the resin composition are laminated after drying. In addition, it is also possible to form a sheet without using a support by supplying a solution in which the resin composition of the present embodiment is dissolved in a solvent into a mold having a sheet-shaped mold cavity and drying it. Obtain single layer slices.
另外,本實施形態之單層片或樹脂複合片之製作時,去除溶劑時的乾燥條件並無特別限制,低溫的話,溶劑容易殘留在樹脂組成物中,高溫的話,樹脂組成物之硬化會進行,故宜為以20℃~200℃之溫度乾燥1~90分鐘。又,單層片或樹脂複合片可在僅將溶劑乾燥之未硬化的狀態下使用,也可因應需要製成半硬化(B階化)之狀態來使用。此外,本實施形態之單層片或樹脂複合片中的樹脂層之厚度,可利用塗佈(塗覆)時所使用的本實施形態之樹脂組成物之溶液的濃度及塗佈厚度來調整,並無特別限制,一般而言,塗佈厚度厚的話,乾燥時溶劑容易殘留,故宜為0.1~500μm。 [實施例] In addition, when the single-layer sheet or resin composite sheet of this embodiment is produced, the drying conditions for removing the solvent are not particularly limited. If the temperature is low, the solvent will easily remain in the resin composition. If the temperature is high, the curing of the resin composition will proceed. , so it is advisable to dry at a temperature of 20°C to 200°C for 1 to 90 minutes. In addition, the single-layer sheet or the resin composite sheet can be used in an uncured state in which the solvent is simply dried, or in a semi-cured (B-staged) state if necessary. In addition, the thickness of the resin layer in the single-layer sheet or resin composite sheet of this embodiment can be adjusted by using the concentration and coating thickness of the solution of the resin composition of this embodiment used during coating. There is no particular limitation. Generally speaking, if the coating thickness is thick, the solvent will easily remain during drying, so it is preferably 0.1 to 500 μm. [Example]
以下舉實施例更具體地說明本發明。以下實施例所示之材料、使用量、比例、處理內容、處理程序等,只要不悖離本發明之概念,則可適當地變更。因此,本發明之範圍並不限於如下所示之具體例。 實施例使用的測定設備等因停產等而不易取得時,可使用其它具有同等性能之設備進行測定。 The present invention will be described in more detail below with reference to examples. The materials, usage amounts, ratios, treatment contents, treatment procedures, etc. shown in the following examples can be appropriately changed as long as they do not deviate from the concept of the present invention. Therefore, the scope of the present invention is not limited to the specific examples shown below. If the measurement equipment used in the examples is difficult to obtain due to discontinuation of production, etc., other equipment with equivalent performance can be used for measurement.
<重量平均分子量及數目平均分子量之測定> 下述具有式(V)表示之構成單元的聚合物(va)等的重量平均分子量(Mw)及數目平均分子量(Mn)係利用凝膠滲透層析(GPC)法進行測定。使用送液泵(島津製作所公司製,LC-20AD)、差示折射率檢測器(島津製作所公司製,RID-10A)、GPC管柱(昭和電工公司製,GPC KF-801、802、803、804),溶劑使用四氫呋喃,流量1.0mL/分鐘,管柱溫度40℃,並使用單分散聚苯乙烯所為之檢量線來實施。 <Measurement of weight average molecular weight and number average molecular weight> The weight average molecular weight (Mw) and the number average molecular weight (Mn) of the following polymer (va) having a structural unit represented by the formula (V) and the like are measured by gel permeation chromatography (GPC). A liquid delivery pump (LC-20AD, manufactured by Shimadzu Corporation), a differential refractive index detector (RID-10A, manufactured by Shimadzu Corporation), and a GPC column (GPC KF-801, 802, 803, manufactured by Showa Denko Corporation) were used. 804), the solvent was tetrahydrofuran, the flow rate was 1.0 mL/min, the column temperature was 40°C, and a calibration line made of monodisperse polystyrene was used for implementation.
<合成例1 具有式(V)表示之構成單元的聚合物(va)之合成> 將二乙烯苯2.25莫耳(292.9g)、乙基乙烯基苯1.32莫耳(172.0g)、苯乙烯11.43莫耳(1190.3g)、乙酸正丙酯15.0莫耳(1532.0g)投入反應器內,於70℃添加600毫莫耳之三氟化硼之二乙醚錯合物,並使其反應4小時。以碳酸氫鈉水溶液停止聚合反應後,利用純水清洗油層3次,於60℃進行減壓脫揮,並回收具有式(V)表示之構成單元的聚合物(va)。稱量得到的具有式(V)表示之構成單元的聚合物(va),確認獲得具有式(V)表示之構成單元的聚合物(va)860.8g。 <Synthesis Example 1 Synthesis of polymer (va) having a structural unit represented by formula (V)> Put 2.25 moles of divinylbenzene (292.9g), 1.32 moles of ethylvinylbenzene (172.0g), 11.43 moles of styrene (1190.3g), and 15.0 moles of n-propyl acetate (1532.0g) into the reactor. , add 600 mmol of boron trifluoride diethyl ether complex at 70°C, and react for 4 hours. After stopping the polymerization reaction with an aqueous sodium bicarbonate solution, the oil layer was washed three times with pure water, devolatilized under reduced pressure at 60° C., and the polymer (va) having the structural unit represented by formula (V) was recovered. The obtained polymer (va) having the structural unit represented by the formula (V) was weighed, and it was confirmed that 860.8 g of the polymer (va) having the structural unit represented by the formula (V) was obtained.
得到的具有式(V)表示之構成單元的聚合物(va)的數目平均分子量Mn為2,060,重量平均分子量Mw為30,700,單分散度Mw/Mn為14.9。藉由實施 13C-NMR及 1H-NMR分析,觀察到在具有式(V)表示之構成單元的聚合物(va)中具有來自使用作為原料之各單體單元的共振譜線。根據NMR測定結果及GC分析結果,具有式(V)表示之構成單元的聚合物(va)中的各單體單元(來自各原料之構成單元)的比例,係求得如下。 來自二乙烯苯之構成單元:20.9莫耳%(24.3質量%) 來自乙基乙烯基苯之構成單元:9.1莫耳%(10.7質量%) 來自苯乙烯之構成單元:70.0莫耳%(65.0質量%) 又,具有來自二乙烯苯之殘存乙烯基的構成單元為16.7莫耳%(18.5質量%)。 The obtained polymer (va) having the structural unit represented by the formula (V) had a number average molecular weight Mn of 2,060, a weight average molecular weight Mw of 30,700, and a monodispersity Mw/Mn of 14.9. By carrying out 13 C-NMR and 1 H-NMR analysis, it was observed that the polymer (va) having the structural unit represented by the formula (V) has a resonance line derived from each monomer unit used as a raw material. Based on the NMR measurement results and GC analysis results, the ratio of each monomer unit (structural unit derived from each raw material) in the polymer (va) having the structural unit represented by formula (V) was determined as follows. Structural units derived from divinylbenzene: 20.9 mol% (24.3 mass%) Structural units derived from ethylvinylbenzene: 9.1 mol% (10.7 mass%) Structural units derived from styrene: 70.0 mol% (65.0 mass% %) Furthermore, the structural unit having residual vinyl groups derived from divinylbenzene was 16.7 mol % (18.5 mass %).
實施例1 將係式(M-2)表示之化合物且為m=0之化合物(日本化藥公司製,「MIR-5000」)21.0質量份、合成例1得到的具有式(V)表示之構成單元的聚合物(va)21.0質量份、如下述結構所示之馬來醯亞胺化合物(m1a)(DIC公司製,「NE-X-9470S」,式(M1)表示之化合物)21.0質量份、熱塑性彈性體(SBS,JSR公司製,TR2250)16.0質量份、磷系阻燃劑(PX-200,大八化學公司製)21.0質量份溶解於甲乙酮(溶劑)並進行混合,獲得清漆。另外,上述各添加量表示固體成分量。 Example 1 21.0 parts by mass of a compound represented by formula (M-2) and having m=0 (manufactured by Nippon Kayaku Co., Ltd., "MIR-5000"), and having a structural unit represented by formula (V) obtained in Synthesis Example 1 Polymer (va) 21.0 parts by mass, maleimide compound (m1a) having the following structure (manufactured by DIC, "NE-X-9470S", compound represented by formula (M1)) 21.0 parts by mass, thermoplastic 16.0 parts by mass of elastomer (SBS, manufactured by JSR Corporation, TR2250) and 21.0 parts by mass of phosphorus-based flame retardant (PX-200, manufactured by Daihachi Chemical Co., Ltd.) were dissolved in methyl ethyl ketone (solvent) and mixed to obtain a varnish. In addition, each addition amount mentioned above represents the solid content amount.
馬來醯亞胺化合物(m1a) [化58] n為1~20之整數。 Maleimide compound (m1a) [Chemical 58] n is an integer from 1 to 20.
<厚度0.8mm之硬化板的試驗片之製造> 藉由從得到的清漆將溶劑蒸發餾去,獲得樹脂組成物粉末。將樹脂組成物粉末填充至1邊100mm、厚度0.8mm之模具中,於雙面配置厚度12μm之銅箔(3EC-M2S-VLP,三井金屬礦業(股)製),以壓力30kg/cm 2、溫度220℃實施120分鐘真空壓製,獲得1邊100mm、厚度0.8mm之硬化板。 使用得到的硬化板實施相對介電常數(Dk)、介電損耗正切(Df)、玻璃轉移溫度(Tg)、剝離強度、除膠渣耐性及吸濕耐熱性之評價。評價結果如表1所示。 <Production of a test piece of a hardened plate with a thickness of 0.8 mm> The solvent was evaporated and distilled from the obtained varnish to obtain a resin composition powder. The resin composition powder was filled into a mold with a side of 100 mm and a thickness of 0.8 mm, and copper foil with a thickness of 12 μm (3EC-M2S-VLP, manufactured by Mitsui Metals Mining Co., Ltd.) was placed on both sides, and the pressure was 30 kg/cm 2 . Perform vacuum pressing at a temperature of 220°C for 120 minutes to obtain a hardened plate with a side of 100mm and a thickness of 0.8mm. The obtained hardened plate was used to evaluate the relative dielectric constant (Dk), dielectric loss tangent (Df), glass transition temperature (Tg), peel strength, desmear resistance and moisture absorption heat resistance. The evaluation results are shown in Table 1.
<測定方法及評價方法> (1)相對介電常數(Dk)及介電損耗正切(Df) 將得到的硬化板之雙面的銅箔利用蝕刻去除後,縮小尺寸至10mmx1mm,獲得評價用樣本。將得到的評價用樣本以120℃乾燥60分鐘後,使用擾動法空腔諧振器,測定頻率10GHz時的乾燥後之相對介電常數(Dk)及介電損耗正切(Df)。測定溫度設為23℃。 擾動法空腔諧振器使用安捷倫(Agilent Technologies)公司製,Agilent8722ES。 相對介電常數(Dk) A:2.50以下 B:超過2.50且為2.60以下 C:超過2.60 介電損耗正切(Df) S:0.0014以下 A:超過0.0014且為0.0018以下 B:超過0.0018且為0.0020以下 C:超過0.0020 <Measurement method and evaluation method> (1) Relative dielectric constant (Dk) and dielectric loss tangent (Df) The copper foil on both sides of the obtained hardened plate was removed by etching, and then the size was reduced to 10 mm x 1 mm to obtain an evaluation sample. The obtained evaluation sample was dried at 120° C. for 60 minutes, and then the dried relative permittivity (Dk) and dielectric loss tangent (Df) at a frequency of 10 GHz were measured using a perturbation method cavity resonator. The measurement temperature was set to 23°C. The perturbation method cavity resonator was manufactured by Agilent Technologies, Agilent8722ES. Relative dielectric constant (Dk) A: Below 2.50 B: More than 2.50 and below 2.60 C: More than 2.60 Dielectric loss tangent (Df) S: 0.0014 or less A: More than 0.0014 and less than 0.0018 B: More than 0.0018 and less than 0.0020 C: More than 0.0020
(2)玻璃轉移溫度(Tg) 玻璃轉移溫度係針對將得到的硬化板之雙面的銅箔利用蝕刻去除後,縮小尺寸至12.7mm×30mm之樣本,使用動態黏彈性測定裝置,依據JIS-K7244-4:1999(塑膠-動態機械特性之試驗方法-第4部:拉伸振動-非共振法),於開始溫度30℃、結束溫度400℃、昇溫速度5℃/分鐘、測定頻率1Hz、氮氣環境下,測定動態黏彈性,定義此時得到的損耗正切(tanδ)達最大值之溫度為玻璃轉移溫度。 動態黏彈性測定裝置使用Seiko Instruments股份有限公司製,EXSTAR6000 DMS6100。 如下所述進行評價。 A:230℃以上 B:200℃以上且未達230℃ C:未達200℃ (2) Glass transition temperature (Tg) The glass transition temperature is based on JIS-K7244-4: 1999 (Plastics - Dynamic) using a dynamic viscoelasticity measuring device after removing the copper foil on both sides of the hardened plate obtained by etching and reducing the size to 12.7mm × 30mm. Test methods for mechanical properties - Part 4: Tensile vibration - non-resonant method), measure dynamic viscoelasticity at a starting temperature of 30°C, an ending temperature of 400°C, a heating rate of 5°C/min, a measurement frequency of 1Hz, and a nitrogen environment. The temperature at which the loss tangent (tanδ) obtained at this time reaches the maximum value is defined as the glass transition temperature. The dynamic viscoelasticity measuring device used was EXSTAR6000 DMS6100 manufactured by Seiko Instruments Co., Ltd. Evaluation was performed as follows. A: Above 230℃ B: Above 200℃ and less than 230℃ C: Less than 200℃
(3)剝離強度 使用如上述般得到的硬化板(10mm×100mm×0.8mm),依據JIS C6481之5.7「剝離強度」之規定,測定銅箔剝離強度(黏接力)2次,求得平均值。測定溫度設為23℃。 如下所述進行評價。 S:0.50kN/m以上 A:0.38kN/m以上且未達0.50kN/m B:0.28kN/m以上且未達0.38kN/m C:未達0.28kN/m (3) Peel strength Using the hardened plate (10 mm × 100 mm × 0.8 mm) obtained as above, the copper foil peel strength (adhesion strength) was measured twice according to the provisions of JIS C6481 5.7 "Peel strength" and the average value was obtained. The measurement temperature was set to 23°C. Evaluation was performed as follows. S: 0.50kN/m or more A: 0.38kN/m or more and less than 0.50kN/m B: 0.28kN/m or more but less than 0.38kN/m C: Less than 0.28kN/m
(4)除膠渣耐性 使用將得到的硬化板之雙面的銅箔利用蝕刻去除後,進行縮小尺寸(50mm×50mm)後之樣本,實施如下之浸漬處理。首先,將得到的樣本於80℃浸漬於膨潤液(Atotech Japan公司製,Swelling Dip Securiganth P)中10分鐘。然後,將浸漬後之樣本於80℃浸漬於粗糙化液(Atotech Japan公司製,Concentrate Compact CP)中5分鐘。然後,將浸漬後之樣本於45℃浸漬於中和液(Atotech Japan公司製,Reduction Conditioner Securiganth P500)中10分鐘。測定實施該浸漬處理2次後之樣本的質量減少率(質量%)。 如下所述進行評價。負號表示質量減少。 A:質量減少率為-4.0質量%~-2.0質量%之範圍。 B:質量減少率在上述範圍以外。 (4) Slag removal resistance The copper foil on both sides of the obtained hardened plate was removed by etching and the sample was reduced in size (50 mm × 50 mm), and the following immersion treatment was performed. First, the obtained sample was immersed in a swelling liquid (Swelling Dip Securiganth P, manufactured by Atotech Japan) at 80° C. for 10 minutes. Then, the immersed sample was immersed in a roughening liquid (Concentrate Compact CP, manufactured by Atotech Japan) at 80° C. for 5 minutes. Then, the immersed sample was immersed in a neutralizing solution (Reduction Conditioner Securiganth P500, manufactured by Atotech Japan) at 45° C. for 10 minutes. The mass reduction rate (mass %) of the sample after the immersion treatment was performed twice was measured. Evaluation was performed as follows. A negative sign indicates a decrease in mass. A: The mass reduction rate ranges from -4.0 mass% to -2.0 mass%. B: The mass reduction rate is outside the above range.
(5)吸濕耐熱性 將得到的硬化板裁切(縮小尺寸)成50mm×50mm,並將單面側之銅箔全部利用蝕刻去除,在另一面側中,將面的一半之銅箔利用蝕刻去除,獲得吸濕耐熱性測定用樣本。將得到的樣本以120℃乾燥60分鐘後,使用壓力鍋試驗機,於121℃、2氣壓之飽和水蒸氣存在下,靜置5小時,再浸漬(dip)於260℃之焊料槽30秒,以目視觀察外觀變化是否有異常。壓力鍋試驗機使用平山製作所公司製,PC-3型。各測定分別實施3次試驗,該3片中,膨脹為0片時評為「A」,膨脹觀察到1~2片時評為「B」,膨脹觀察到3片時評為「C」。外觀的觀察採5人專家實施之多數決。 (5) Moisture absorption and heat resistance The obtained hardened board is cut (reduced in size) to 50 mm × 50 mm, and all the copper foil on one side is removed by etching. On the other side, half of the copper foil on the other side is removed by etching to obtain moisture absorption and heat resistance. Samples for sex determination. After drying the obtained sample at 120°C for 60 minutes, use a pressure cooker testing machine to let it stand for 5 hours in the presence of saturated water vapor at 121°C and 2 atmospheres, and then dip it into a solder bath at 260°C for 30 seconds. Visually observe whether there are any abnormal changes in appearance. The pressure cooker testing machine used was model PC-3 manufactured by Hirayama Seisakusho Co., Ltd. Each measurement was performed three times, and among the three tablets, when swelling was observed in 0 tablets, it was rated as "A", when swelling was observed in 1 to 2 tablets, it was rated as "B", and when swelling was observed in 3 tablets, it was rated as "C". The appearance observation is carried out by majority vote of 5 experts.
實施例2 將實施例1中係式(M-2)表示之化合物且為m=0之化合物(日本化藥公司製,「MIR-5000」)的含量變更為18.9質量份、合成例1得到的具有式(V)表示之構成單元的聚合物(va)的含量變更為21.8質量份、馬來醯亞胺化合物(m1a)(DIC公司製,「NE-X-9470S」)的含量變更為22.3質量份,其它則同樣地實施。結果如表1所示。 Example 2 In Example 1, the content of the compound represented by formula (M-2) and having m=0 (manufactured by Nippon Kayaku Co., Ltd., "MIR-5000") was changed to 18.9 parts by mass, and Synthesis Example 1 obtained a compound having the formula The content of the polymer (va) of the structural unit represented by (V) was changed to 21.8 parts by mass, and the content of the maleimide compound (m1a) (manufactured by DIC Corporation, "NE-X-9470S") was changed to 22.3 parts by mass. , others are implemented in the same way. The results are shown in Table 1.
實施例3 將實施例1中係式(M-2)表示之化合物且為m=0之化合物(日本化藥公司製,「MIR-5000」)的含量變更為20.9質量份、合成例1得到的具有式(V)表示之構成單元的聚合物(va)的含量變更為16.8質量份、馬來醯亞胺化合物(m1a)(DIC公司製,「NE-X-9470S」)的含量變更為25.3質量份,其它則同樣地實施。結果如表1所示。 Example 3 In Example 1, the content of the compound represented by formula (M-2) and having m=0 (manufactured by Nippon Kayaku Co., Ltd., "MIR-5000") was changed to 20.9 parts by mass, and Synthesis Example 1 obtained a compound having the formula The content of the polymer (va) of the structural unit represented by (V) was changed to 16.8 parts by mass, and the content of the maleimide compound (m1a) (manufactured by DIC Corporation, "NE-X-9470S") was changed to 25.3 parts by mass. , others are implemented in the same way. The results are shown in Table 1.
實施例4 將實施例1中係式(M-2)表示之化合物且為m=0之化合物(日本化藥公司製,「MIR-5000」)的含量變更為13.0質量份、合成例1得到的具有式(V)表示之構成單元的聚合物(va)的含量變更為5.0質量份、馬來醯亞胺化合物(m1a)(DIC公司製,「NE-X-9470S」)的含量變更為45.0質量份,其它則同樣地實施。結果如表1所示。 Example 4 In Example 1, the content of the compound represented by formula (M-2) and having m=0 ("MIR-5000" manufactured by Nippon Kayaku Co., Ltd.) was changed to 13.0 parts by mass, and Synthesis Example 1 obtained a compound having the formula The content of the polymer (va) of the structural unit represented by (V) was changed to 5.0 parts by mass, and the content of the maleimide compound (m1a) (manufactured by DIC Corporation, "NE-X-9470S") was changed to 45.0 parts by mass. , others are implemented in the same way. The results are shown in Table 1.
實施例5 將實施例1中係式(M-2)表示之化合物且為m=0之化合物(日本化藥公司製,「MIR-5000」)的含量變更為24.0質量份、合成例1得到的具有式(V)表示之構成單元的聚合物(va)的含量變更為34.0質量份、馬來醯亞胺化合物(m1a)(DIC公司製,「NE-X-9470S」)的含量變更為5.0質量份,其它則同樣地實施。結果如表1所示。 Example 5 In Example 1, the content of the compound represented by formula (M-2) and having m=0 (manufactured by Nippon Kayaku Co., Ltd., "MIR-5000") was changed to 24.0 parts by mass, and Synthesis Example 1 obtained a compound having the formula The content of the polymer (va) of the structural unit represented by (V) was changed to 34.0 parts by mass, and the content of the maleimide compound (m1a) (manufactured by DIC Corporation, "NE-X-9470S") was changed to 5.0 parts by mass. , others are implemented in the same way. The results are shown in Table 1.
實施例6 將實施例1中係式(M-2)表示之化合物且為m=0之化合物(日本化藥公司製,「MIR-5000」)的含量變更為5.0質量份、合成例1得到的具有式(V)表示之構成單元的聚合物(va)的含量變更為29.0質量份、馬來醯亞胺化合物(m1a)(DIC公司製,「NE-X-9470S」)的含量變更為29.0質量份,其它則同樣地實施。結果如表1所示。 Example 6 In Example 1, the content of the compound represented by formula (M-2) and having m=0 (manufactured by Nippon Kayaku Co., Ltd., "MIR-5000") was changed to 5.0 parts by mass, and Synthesis Example 1 obtained a compound having the formula The content of the polymer (va) of the structural unit represented by (V) was changed to 29.0 parts by mass, and the content of the maleimide compound (m1a) (manufactured by DIC Corporation, "NE-X-9470S") was changed to 29.0 parts by mass. , others are implemented in the same way. The results are shown in Table 1.
實施例7 將實施例1中係式(M-2)表示之化合物且為m=0之化合物(日本化藥公司製,「MIR-5000」)的含量變更為18.0質量份、合成例1得到的具有式(V)表示之構成單元的聚合物(va)的含量變更為40.0質量份、馬來醯亞胺化合物(m1a)(DIC公司製,「NE-X-9470S」)的含量變更為5.0質量份,其它則同樣地實施。結果如表1所示。 Example 7 In Example 1, the content of the compound represented by formula (M-2) and having m=0 (manufactured by Nippon Kayaku Co., Ltd., "MIR-5000") was changed to 18.0 parts by mass, and a compound having the formula was obtained in Synthesis Example 1. The content of the polymer (va) of the structural unit represented by (V) was changed to 40.0 parts by mass, and the content of the maleimide compound (m1a) (manufactured by DIC Corporation, "NE-X-9470S") was changed to 5.0 parts by mass. , others are implemented in the same way. The results are shown in Table 1.
比較例1 不使用實施例1中係式(M-2)表示之化合物且為m=0之化合物(日本化藥公司製,「MIR-5000」)及具有式(V)表示之構成單元的聚合物(va),並將馬來醯亞胺化合物(m1a)(DIC公司製,「NE-X-9470S」)的含量變更為63.0質量份,其它則同樣地實施。結果如表2所示。 Comparative example 1 The compound represented by the formula (M-2) in Example 1 and having m=0 (manufactured by Nippon Kayaku Co., Ltd., "MIR-5000") and the polymer having the structural unit represented by the formula (V) ( va), and the content of the maleimide compound (m1a) (manufactured by DIC, "NE-X-9470S") was changed to 63.0 parts by mass, and the other operations were carried out in the same manner. The results are shown in Table 2.
比較例2 不使用實施例1中具有式(V)表示之構成單元的聚合物(va)及馬來醯亞胺化合物(m1a)(DIC公司製,「NE-X-9470S」),並將係式(M-2)表示之化合物且為m=0之化合物(日本化藥公司製,「MIR-5000」)含量變更為63.0質量份,其它則同樣地實施。結果如表2所示。 Comparative example 2 The polymer (va) and the maleimide compound (m1a) (manufactured by DIC Corporation, "NE-X-9470S") having the structural unit represented by formula (V) in Example 1 were not used, and the formula ( The content of the compound represented by M-2) and having m=0 (manufactured by Nippon Kayaku Co., Ltd., "MIR-5000") was changed to 63.0 parts by mass, and the other operations were carried out in the same manner. The results are shown in Table 2.
比較例3 不使用實施例1中係式(M-2)表示之化合物且為m=0之化合物(日本化藥公司製,「MIR-5000」)及馬來醯亞胺化合物(m1a)(DIC公司製,「NE-X-9470S」),並將具有式(V)表示之構成單元的聚合物(va)的含量變更為63.0質量份,其它則同樣地實施。結果如表2所示。 Comparative example 3 The compound represented by the formula (M-2) in Example 1 and having m=0 (manufactured by Nippon Kayaku Co., Ltd., "MIR-5000") and the maleimide compound (m1a) (manufactured by DIC Corporation) were not used. , "NE-X-9470S"), and the content of the polymer (va) having the structural unit represented by formula (V) was changed to 63.0 parts by mass, and the other operations were carried out in the same manner. The results are shown in Table 2.
比較例4 將實施例1中係式(M-2)表示之化合物且為m=0之化合物(日本化藥公司製,「MIR-5000」)的含量變更為31.5質量份、馬來醯亞胺化合物(m1a)(DIC公司製,「NE-X-9470S」)的含量變更為31.5質量份,且不使用具有式(V)表示之構成單元的聚合物(va),其它則同樣地實施。結果如表2所示。 Comparative example 4 In Example 1, the content of the compound represented by formula (M-2) and m=0 (manufactured by Nippon Kayaku Co., Ltd., "MIR-5000") was changed to 31.5 parts by mass, and the content of the maleimide compound ( The content of m1a) (manufactured by DIC, "NE-X-9470S") was changed to 31.5 parts by mass, and the polymer (va) having the structural unit represented by the formula (V) was not used, and the other operations were carried out in the same manner. The results are shown in Table 2.
比較例5 不使用實施例1中係式(M-2)表示之化合物且為m=0之化合物(日本化藥公司製,「MIR-5000」),並將具有式(V)表示之構成單元的聚合物(va)的含量變更為31.5質量份、馬來醯亞胺化合物(m1a)(DIC公司製,「NE-X-9470S」)的含量變更為31.5質量份,其它則同樣地實施。結果如表2所示。 Comparative example 5 In Example 1, the compound represented by the formula (M-2) and having m=0 (manufactured by Nippon Kayaku Co., Ltd., "MIR-5000") was not used, and the polymerization of the structural unit having the structural unit represented by the formula (V) was carried out The content of the substance (va) was changed to 31.5 parts by mass, the content of the maleimide compound (m1a) (manufactured by DIC, "NE-X-9470S") was changed to 31.5 parts by mass, and the other operations were carried out in the same manner. The results are shown in Table 2.
比較例6 將實施例1中具有式(V)表示之構成單元的聚合物(va)21.0質量份變更為等量之馬來醯亞胺化合物(日本化藥股份有限公司製,MIR-3000,如述結構所示),其它則同樣地實施。結果如表2所示。 [化59] Comparative Example 6 In Example 1, 21.0 parts by mass of the polymer (va) having a structural unit represented by formula (V) was replaced with an equivalent amount of a maleimide compound (MIR-3000, manufactured by Nippon Kayaku Co., Ltd. (as shown in the above structure), others are implemented in the same way. The results are shown in Table 2. [Chemistry 59]
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