TW202338049A - adhesive sheet - Google Patents

adhesive sheet Download PDF

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Publication number
TW202338049A
TW202338049A TW111126256A TW111126256A TW202338049A TW 202338049 A TW202338049 A TW 202338049A TW 111126256 A TW111126256 A TW 111126256A TW 111126256 A TW111126256 A TW 111126256A TW 202338049 A TW202338049 A TW 202338049A
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adhesive
layer
adhesive layer
mentioned
adhesive sheet
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TW111126256A
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由藤拓三
加藤和通
中尾航大
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日商日東電工股份有限公司
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    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J7/00Adhesives in the form of films or foils
    • C09J7/30Adhesives in the form of films or foils characterised by the adhesive composition
    • C09J7/38Pressure-sensitive adhesives [PSA]
    • C09J7/381Pressure-sensitive adhesives [PSA] based on macromolecular compounds obtained by reactions involving only carbon-to-carbon unsaturated bonds
    • C09J7/385Acrylic polymers
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J7/00Adhesives in the form of films or foils
    • C09J7/30Adhesives in the form of films or foils characterised by the adhesive composition
    • C09J7/38Pressure-sensitive adhesives [PSA]
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K5/00Use of organic ingredients
    • C08K5/0008Organic ingredients according to more than one of the "one dot" groups of C08K5/01 - C08K5/59
    • C08K5/0025Crosslinking or vulcanising agents; including accelerators
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J11/00Features of adhesives not provided for in group C09J9/00, e.g. additives
    • C09J11/02Non-macromolecular additives
    • C09J11/06Non-macromolecular additives organic
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J133/00Adhesives based on homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by only one carboxyl radical, or of salts, anhydrides, esters, amides, imides, or nitriles thereof; Adhesives based on derivatives of such polymers
    • C09J133/04Homopolymers or copolymers of esters
    • C09J133/06Homopolymers or copolymers of esters of esters containing only carbon, hydrogen and oxygen, the oxygen atom being present only as part of the carboxyl radical
    • C09J133/08Homopolymers or copolymers of acrylic acid esters
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J7/00Adhesives in the form of films or foils
    • C09J7/20Adhesives in the form of films or foils characterised by their carriers
    • C09J7/22Plastics; Metallised plastics
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08FMACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
    • C08F220/00Copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and only one being terminated by only one carboxyl radical or a salt, anhydride ester, amide, imide or nitrile thereof
    • C08F220/02Monocarboxylic acids having less than ten carbon atoms; Derivatives thereof
    • C08F220/10Esters
    • C08F220/12Esters of monohydric alcohols or phenols
    • C08F220/16Esters of monohydric alcohols or phenols of phenols or of alcohols containing two or more carbon atoms
    • C08F220/18Esters of monohydric alcohols or phenols of phenols or of alcohols containing two or more carbon atoms with acrylic or methacrylic acids
    • C08F220/1804C4-(meth)acrylate, e.g. butyl (meth)acrylate, isobutyl (meth)acrylate or tert-butyl (meth)acrylate
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08FMACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
    • C08F220/00Copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and only one being terminated by only one carboxyl radical or a salt, anhydride ester, amide, imide or nitrile thereof
    • C08F220/02Monocarboxylic acids having less than ten carbon atoms; Derivatives thereof
    • C08F220/10Esters
    • C08F220/12Esters of monohydric alcohols or phenols
    • C08F220/16Esters of monohydric alcohols or phenols of phenols or of alcohols containing two or more carbon atoms
    • C08F220/18Esters of monohydric alcohols or phenols of phenols or of alcohols containing two or more carbon atoms with acrylic or methacrylic acids
    • C08F220/1808C8-(meth)acrylate, e.g. isooctyl (meth)acrylate or 2-ethylhexyl (meth)acrylate
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J2203/00Applications of adhesives in processes or use of adhesives in the form of films or foils
    • C09J2203/326Applications of adhesives in processes or use of adhesives in the form of films or foils for bonding electronic components such as wafers, chips or semiconductors
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J2301/00Additional features of adhesives in the form of films or foils
    • C09J2301/10Additional features of adhesives in the form of films or foils characterized by the structural features of the adhesive tape or sheet
    • C09J2301/12Additional features of adhesives in the form of films or foils characterized by the structural features of the adhesive tape or sheet by the arrangement of layers
    • C09J2301/124Additional features of adhesives in the form of films or foils characterized by the structural features of the adhesive tape or sheet by the arrangement of layers the adhesive layer being present on both sides of the carrier, e.g. double-sided adhesive tape
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J2301/00Additional features of adhesives in the form of films or foils
    • C09J2301/10Additional features of adhesives in the form of films or foils characterized by the structural features of the adhesive tape or sheet
    • C09J2301/12Additional features of adhesives in the form of films or foils characterized by the structural features of the adhesive tape or sheet by the arrangement of layers
    • C09J2301/124Additional features of adhesives in the form of films or foils characterized by the structural features of the adhesive tape or sheet by the arrangement of layers the adhesive layer being present on both sides of the carrier, e.g. double-sided adhesive tape
    • C09J2301/1242Additional features of adhesives in the form of films or foils characterized by the structural features of the adhesive tape or sheet by the arrangement of layers the adhesive layer being present on both sides of the carrier, e.g. double-sided adhesive tape the opposite adhesive layers being different
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J2301/00Additional features of adhesives in the form of films or foils
    • C09J2301/20Additional features of adhesives in the form of films or foils characterized by the structural features of the adhesive itself
    • C09J2301/208Additional features of adhesives in the form of films or foils characterized by the structural features of the adhesive itself the adhesive layer being constituted by at least two or more adjacent or superposed adhesive layers, e.g. multilayer adhesive
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J2301/00Additional features of adhesives in the form of films or foils
    • C09J2301/30Additional features of adhesives in the form of films or foils characterized by the chemical, physicochemical or physical properties of the adhesive or the carrier
    • C09J2301/312Additional features of adhesives in the form of films or foils characterized by the chemical, physicochemical or physical properties of the adhesive or the carrier parameters being the characterizing feature
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J2301/00Additional features of adhesives in the form of films or foils
    • C09J2301/40Additional features of adhesives in the form of films or foils characterized by the presence of essential components
    • C09J2301/412Additional features of adhesives in the form of films or foils characterized by the presence of essential components presence of microspheres
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J2433/00Presence of (meth)acrylic polymer

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  • Chemical & Material Sciences (AREA)
  • Organic Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Health & Medical Sciences (AREA)
  • Medicinal Chemistry (AREA)
  • Polymers & Plastics (AREA)
  • Adhesive Tapes (AREA)
  • Adhesives Or Adhesive Processes (AREA)
  • Laminated Bodies (AREA)

Abstract

The present invention provides an adhesive sheet having a satisfactory balance of reduced adhesive residue when peeling and excellent conformability to the surface shape of an adherend. Provided is an adhesive sheet comprising a base material and an adhesive layer that is disposed on at least one side of the base material. The indentation hardness H1 of the surface of the adhesive layer of the adhesive sheet is 0.10-0.50 MPa, and, in a cross-section of the adhesive sheet, the indentation hardness H2 measured at a position 4 [mu]m from the base material in the direction of the surface of the adhesive layer is 0.001-0.090 MPa.

Description

黏著片材adhesive sheet

本發明係關於一種黏著片材。本申請主張基於2021年7月13日提出申請之日本專利申請2021-115926號之優先權,該申請之所有內容以參照之形式併入本說明書中。The present invention relates to an adhesive sheet. This application claims priority based on Japanese Patent Application No. 2021-115926 filed on July 13, 2021, and all the contents of this application are incorporated into this specification by reference.

於包含半導體晶片之半導體零件之製造中,有時對該半導體晶片進行樹脂密封,以防止半導體晶片損傷、金屬配線擴張等。於樹脂密封步驟中,就作業性等觀點而言,有時於黏著片材之上進行半導體晶片之樹脂密封。例如,將複數個半導體晶片配置於作為暫時固定材之黏著片材之黏著劑層上,於該黏著劑層上對半導體晶片進行一次性密封。其後,於特定之後續步驟中,自包含密封樹脂及半導體晶片之構造體剝離上述黏著片材。 先前技術文獻 專利文獻 In the manufacturing of semiconductor parts including semiconductor wafers, the semiconductor wafers are sometimes resin-sealed to prevent damage to the semiconductor wafers, expansion of metal wiring, and the like. In the resin sealing step, from the viewpoint of workability and the like, the semiconductor wafer may be resin-sealed on an adhesive sheet. For example, a plurality of semiconductor wafers are arranged on an adhesive layer of an adhesive sheet serving as a temporary fixing material, and the semiconductor wafers are once sealed on the adhesive layer. Thereafter, in a specific subsequent step, the adhesive sheet is peeled off from the structure including the sealing resin and the semiconductor chip. Prior technical literature patent documents

專利文獻1:日本專利申請公開2001-308116號公報 專利文獻2:日本專利申請公開2001-313350號公報 Patent Document 1: Japanese Patent Application Publication No. 2001-308116 Patent Document 2: Japanese Patent Application Publication No. 2001-313350

[發明所欲解決之問題][Problem to be solved by the invention]

作為如上所述之步驟中所使用之黏著片材,要求當自包含密封樹脂及半導體晶片之構造體剝離上述黏著片材時,上述構造體上不會產生糊劑殘留(黏著劑殘留)。為了抑制上述糊劑殘留,在上述黏著片材中配置有半導體晶片之黏著劑層通常藉由彈性模數非常高之黏著劑形成。但,在半導體晶片之表面可能存在事先形成之金屬配線等所引起之階差,結果,若使黏著劑層變為高彈性模數,則黏著劑無法充分密接於上述晶片表面之階差,容易產生密封樹脂侵入至上述晶片與黏著劑之界面之缺陷。As the adhesive sheet used in the above-mentioned step, it is required that no paste residue (adhesive residue) is generated on the structure when the adhesive sheet is peeled off from the structure containing the sealing resin and the semiconductor chip. In order to suppress the above-mentioned paste residue, the adhesive layer in which the semiconductor chip is arranged in the above-mentioned adhesive sheet is usually formed with an adhesive having a very high elastic modulus. However, there may be steps on the surface of the semiconductor wafer caused by metal wiring formed in advance. As a result, if the adhesive layer has a high elastic modulus, the adhesive will not be able to fully adhere to the steps on the surface of the wafer, and it is easy to Defects occur when the sealing resin invades the interface between the chip and the adhesive.

本發明係鑒於上述狀況而創新者,本發明之目的在於提供一種黏著片材,其平衡性良好地兼顧剝離時之糊劑殘留之抑制、及對被黏著體之表面形狀之良好追隨性。 [解決問題之技術手段] The present invention was innovated in view of the above situation, and an object of the present invention is to provide an adhesive sheet that has a good balance between suppression of paste residue during peeling and good followability to the surface shape of the adherend. [Technical means to solve problems]

藉由該說明書所提供之黏著片材具備基材、及配置於該基材之至少單側之黏著劑層。關於上述黏著片材,於使用奈米壓痕儀所進行之壓痕硬度測定中,上述黏著劑層之表面之壓痕硬度H1為0.10 MPa以上0.50 MPa以下,且於上述黏著片材之截面中在自上述基材向上述黏著劑層之表面側距離4 μm之位置處所測得之壓痕硬度H2為0.001 MPa以上0.090 MPa以下。藉由將黏著劑層之表面作為測定位置(以下,亦稱為「測定位置A」)處所測得之壓痕硬度H1為0.10 MPa以上,可抑制剝離時之糊劑殘留。又,藉由於上述測定位置A之內側(基材側)、具體而言於上述黏著片材之截面中在自上述基材向上述黏著劑層之表面側距離4 μm之位置(以下,亦稱為「測定位置B」)處所測得之壓痕硬度H2為0.090 MPa以下,可提高對被黏著體之表面形狀之追隨性。因此,根據壓痕硬度H1、H2處於上述範圍之黏著片材,可平衡性良好地兼顧剝離時之糊劑殘留之抑制、及對被黏著體之表面形狀之良好追隨性。The adhesive sheet provided by this specification includes a base material and an adhesive layer arranged on at least one side of the base material. Regarding the above-mentioned adhesive sheet, in the indentation hardness measurement using a nanoindentation instrument, the indentation hardness H1 of the surface of the above-mentioned adhesive layer is 0.10 MPa or more and 0.50 MPa or less, and in the cross section of the above-mentioned adhesive sheet The indentation hardness H2 measured at a distance of 4 μm from the base material to the surface side of the adhesive layer is 0.001 MPa or more and 0.090 MPa or less. By setting the indentation hardness H1 measured at the surface of the adhesive layer as the measurement position (hereinafter also referred to as "measurement position A") to be 0.10 MPa or more, paste residue during peeling can be suppressed. In addition, by measuring the inner side (substrate side) of the above-mentioned measurement position A, specifically, in the cross section of the above-mentioned adhesive sheet, the position 4 μm away from the above-mentioned substrate to the surface side of the above-mentioned adhesive layer (hereinafter also referred to as The indentation hardness H2 measured at the "measurement position B") is 0.090 MPa or less, which can improve the ability to follow the surface shape of the adherend. Therefore, an adhesive sheet with indentation hardness H1 and H2 in the above range can achieve a well-balanced combination of suppression of paste residue during peeling and good followability to the surface shape of the adherend.

於若干態樣中,上述壓痕硬度H2[MPa]相對於上述壓痕硬度H1[MPa]之比(H2/H1)為0.002以上0.90以下。根據測定位置B(內部)處之壓痕硬度H2為測定位置A(表面)處之壓痕硬度H1之0.90倍以下之黏著片材,可較佳地兼顧對糊劑殘留之抑制及對表面形狀之追隨性。In some aspects, the ratio (H2/H1) of the above-mentioned indentation hardness H2 [MPa] to the above-mentioned indentation hardness H1 [MPa] is 0.002 or more and 0.90 or less. According to the adhesive sheet, the indentation hardness H2 at the measured position B (inside) is less than 0.90 times the indentation hardness H1 at the measured position A (surface), which can better balance the suppression of paste residue and the surface shape. The following nature.

於若干態樣中,於使用奈米壓痕儀所進行之拉絲性評價中,上述黏著劑層之表面之拉絲性D1為50 nm以上500 nm以下。關於黏著劑層之表面(測定位置A)處之拉絲性D1為500 nm以下,就對糊劑殘留之抑制之觀點而言,黏著劑層之表面(測定位置A)處之拉絲性D1為500 nm以下較為有利。於上述拉絲性評價中,於上述黏著片材之截面中在自上述基材向上述黏著劑層之表面側距離4 μm之位置(測定位置B)處所測得之拉絲性D2較佳為150 nm以上1000 nm以下。根據拉絲性D2處於上述範圍之黏著劑層,容易實現良好之對表面形狀之追隨性。In some aspects, in the evaluation of stringiness using a nanoindentation instrument, the stringiness D1 of the surface of the adhesive layer is 50 nm or more and 500 nm or less. The stringiness D1 on the surface of the adhesive layer (measurement position A) is 500 nm or less. From the viewpoint of suppressing paste residue, the stringiness D1 on the surface of the adhesive layer (measurement position A) is 500 nm. nm and below are more advantageous. In the above evaluation of stringiness, the stringiness D2 measured at a position (measurement position B) 4 μm away from the base material to the surface side of the adhesive layer in the cross section of the adhesive sheet is preferably 150 nm. Above 1000 nm and below. With the adhesive layer having the drawability D2 in the above range, it is easy to achieve good followability to the surface shape.

於若干態樣中,上述拉絲性D2[nm]相對於上述拉絲性D1[nm]之比(D2/D1)為0.3以上20.0以下。根據比(D2/D1)處於上述範圍之黏著片材,容易較佳地兼顧對糊劑殘留之抑制及對表面形狀之追隨性。In some aspects, the ratio (D2/D1) of the stringability D2 [nm] to the stringability D1 [nm] (D2/D1) is 0.3 or more and 20.0 or less. An adhesive sheet with a ratio (D2/D1) within the above range is likely to achieve a better balance between the suppression of paste residue and the ability to follow the surface shape.

於若干態樣中,黏著劑層之初始厚度T0[μm]與將4-第三丁基苯基縮水甘油醚滴下至該黏著劑層之表面並靜置1分鐘後的該黏著劑層之厚度T1[μm]之差(T1-T0;以下,亦稱為「厚度變化量」)為20 μm以下。關於具備厚度變化量較小之黏著劑層之黏著片材,例如於實施將半導體晶片配置於該黏著劑層上並利用樹脂密封該半導體晶片之步驟的使用態樣中,由於不易在半導體晶片與密封樹脂之間產生階差(間隙),故而較佳。In some aspects, the initial thickness T0 [μm] of the adhesive layer and the thickness of the adhesive layer after dropping 4-tert-butylphenyl glycidyl ether onto the surface of the adhesive layer and leaving it for 1 minute The difference in T1 [μm] (T1-T0; hereinafter also referred to as “thickness variation”) is 20 μm or less. Regarding an adhesive sheet having an adhesive layer with a small change in thickness, for example, in a usage state in which a semiconductor wafer is disposed on the adhesive layer and the semiconductor wafer is sealed with a resin, it is difficult to separate the semiconductor wafer from the adhesive layer. It is preferable because a step difference (gap) is generated between the sealing resins.

關於若干態樣之黏著片材,使用熱機械分析裝置(Thermomechanical Analyzer;TMA),在測定環境溫度23℃、壓入負載0.01 N、壓入負荷時間60分鐘之條件下所測得之針入探針自上述黏著劑層表面之沉入量為3.50 μm以上20.0 μm以下。根據沉入量處於上述範圍之黏著片材,例如於實施將半導體晶片配置於該黏著劑層上並利用樹脂密封該半導體晶片之步驟的使用態樣中,可平衡性良好地兼顧對半導體晶片之表面形狀之追隨性、及半導體晶片嵌埋至黏著片材之抑制。Regarding certain types of adhesive sheets, a thermomechanical analyzer (TMA) was used to measure the needle penetration under the conditions of an ambient temperature of 23°C, a press-in load of 0.01 N, and a press-in load time of 60 minutes. The sinking amount of the needle from the surface of the above-mentioned adhesive layer is 3.50 μm or more and 20.0 μm or less. An adhesive sheet with a sinking amount within the above range can be used in a manner in which, for example, a semiconductor chip is disposed on the adhesive layer and the semiconductor chip is sealed with a resin. Surface shape followability and suppression of semiconductor chip embedding in the adhesive sheet.

於此處所揭示之黏著片材之若干態樣中,上述黏著劑層之厚度為5 μm以上110 μm以下。根據上述厚度之黏著劑層,可較佳地發揮由使測定位置A與測定位置B具有不同特性所引起之效果。In some aspects of the adhesive sheet disclosed herein, the thickness of the adhesive layer is from 5 μm to 110 μm. According to the adhesive layer having the above thickness, the effect caused by having different characteristics between the measurement position A and the measurement position B can be better exerted.

於若干態樣中,上述基材係包含玻璃轉移溫度(Tg)為25℃以上之樹脂材料之基材膜。關於在該基材膜上具有上述黏著劑層之構成之黏著片材,例如於實施將半導體晶片配置於該黏著片材之黏著劑層上並利用樹脂密封該半導體晶片之步驟的使用態樣中,即便在該步驟中進行加熱,亦可抑制半導體晶片嵌埋至黏著片材,抑制半導體晶片與密封樹脂之階差(間隙)。In some aspects, the above-mentioned substrate is a substrate film including a resin material with a glass transition temperature (Tg) of 25°C or above. The adhesive sheet having the above-described adhesive layer on the base film is used, for example, in a method of arranging a semiconductor chip on the adhesive layer of the adhesive sheet and sealing the semiconductor chip with a resin. , even if heating is performed in this step, embedding of the semiconductor wafer in the adhesive sheet can be suppressed, and the step difference (gap) between the semiconductor wafer and the sealing resin can be suppressed.

若干態樣之黏著片材對於聚對苯二甲酸乙二酯(PET)膜之黏著力為0.05 N/20 mm以上1.00 N/20 mm以下。若為此種範圍,則可較佳地固定被黏著體(例如,半導體晶片),且當剝離黏著片材時可抑制對被黏著體施加之負荷。The adhesive force of certain types of adhesive sheets to polyethylene terephthalate (PET) film is 0.05 N/20 mm or more and 1.00 N/20 mm or less. If it is within this range, the adherend (for example, a semiconductor wafer) can be suitably fixed, and the load applied to the adherend when peeling off the adhesive sheet can be suppressed.

於若干態樣中,於150℃下對上述黏著片材加熱1小時後,於23℃下測得之上述黏著劑層對於上述基材之抓固力為4.00 N/20 mm以上。關於表現上述抓固力之黏著片材,例如於實施將半導體晶片配置於該黏著片材之黏著劑層上並利用樹脂密封該半導體晶片之步驟的使用態樣中,即便在該步驟中進行加熱,亦由於在其後之剝離步驟中可抑制糊劑殘留,故而較佳。In some aspects, after heating the above-mentioned adhesive sheet at 150°C for 1 hour, the gripping force of the above-mentioned adhesive layer on the above-mentioned substrate measured at 23°C is more than 4.00 N/20 mm. Regarding the adhesive sheet that exhibits the above-mentioned gripping force, for example, in the use mode of carrying out the step of arranging a semiconductor chip on the adhesive layer of the adhesive sheet and sealing the semiconductor chip with a resin, even if heating is performed in this step , is also preferable because it can suppress paste residue in the subsequent peeling step.

於若干態樣中,構成上述黏著劑層之至少表面之黏著劑係將丙烯酸系聚合物作為基礎聚合物之丙烯酸系黏著劑。此處所揭示之技術可於具備至少表面(黏著面)包含丙烯酸系黏著劑之黏著劑層之黏著片材之態樣中較佳地實施。In some aspects, the adhesive constituting at least the surface of the adhesive layer is an acrylic adhesive using an acrylic polymer as a base polymer. The technology disclosed here can be preferably implemented in an adhesive sheet having an adhesive layer including an acrylic adhesive on at least the surface (adhesive surface).

於若干態樣中,上述丙烯酸系聚合物之SP(Solubility Parameter,溶解度參數)值為18.0~20.0。藉由將SP值處於上述範圍之丙烯酸系聚合物作為基礎聚合物之丙烯酸系黏著劑構成黏著面,藉此容易實現上述範圍之壓痕硬度H1,且例如於實施將半導體晶片配置於該黏著面上並利用樹脂密封該半導體晶片之步驟的使用態樣中,亦容易抑制對於密封樹脂之黏著力變得過高。In some aspects, the SP (Solubility Parameter) value of the acrylic polymer is 18.0 to 20.0. By forming an adhesive surface with an acrylic adhesive using an acrylic polymer with an SP value in the above range as the base polymer, the indentation hardness H1 in the above range can be easily achieved, and for example, a semiconductor wafer can be placed on the adhesive surface. In the usage mode of the step of sealing the semiconductor chip with resin, it is also easy to prevent the adhesive force to the sealing resin from becoming too high.

於此處所揭示之黏著片材之若干態樣中,上述黏著劑層包含:構成該黏著劑層之表面之A層、及配置於上述A層與上述基材之間且與該基材鄰接之B層。此處所揭示之黏著片材可如此以具備包含A層(表面層)及B層(下塗層)之構造之黏著劑層之態樣較佳地實施。In some aspects of the adhesive sheet disclosed here, the above-mentioned adhesive layer includes: an A layer constituting the surface of the adhesive layer, and a layer disposed between the above-mentioned A layer and the above-mentioned base material and adjacent to the base material. B floor. The adhesive sheet disclosed here can be preferably implemented as having an adhesive layer having a structure including layer A (surface layer) and layer B (undercoat layer).

上述A層之厚度L1例如較佳為1 μm以上10 μm以下。根據此種厚度之A層,容易較佳地兼顧對糊劑殘留之抑制及對表面形狀之追隨性。 上述B層之厚度L2例如較佳為4 μm以上100 μm以下。根據此種厚度之B層,容易較佳地兼顧對糊劑殘留之抑制及對表面形狀之追隨性。 上述B層之厚度L2[μm]相對於上述A層之厚度L1[μm]之比(L2/L1)較佳為1.0~100.0。 The thickness L1 of the above-mentioned layer A is preferably 1 μm or more and 10 μm or less, for example. With such a thickness of the A layer, it is easy to achieve a better balance between the suppression of paste residue and the ability to follow the surface shape. The thickness L2 of the above-mentioned B layer is preferably not less than 4 μm and not more than 100 μm, for example. With such a thickness of the B layer, it is easy to achieve a better balance between the suppression of paste residue and the ability to follow the surface shape. The ratio (L2/L1) of the thickness L2 [μm] of the above-mentioned layer B to the thickness L1 [μm] of the above-mentioned layer A is preferably 1.0 to 100.0.

於若干態樣中,上述A層之利用脈衝NMR(Nuclear Magnetic Resonance,核磁共振)所得之S成分之T 2弛豫時間(T 2s)為45 μsec以下,上述B層之利用脈衝NMR所得之S成分之T 2弛豫時間(T 2s)比45 μsec長。根據具有包含滿足上述弛豫時間(T 2s)之A層及B層之黏著劑層的黏著片材,容易較佳地兼顧對黏著劑層/密封樹脂間之成分移行之抑制及對表面形狀之追隨性。 In some aspects, the T 2 relaxation time (T 2s ) of the S component obtained by pulse NMR (Nuclear Magnetic Resonance, Nuclear Magnetic Resonance) of the above-mentioned layer A is 45 μsec or less, and the S component obtained by pulse NMR of the above-mentioned layer B is The T 2 relaxation time (T 2s ) of the component is longer than 45 μsec. According to the adhesive sheet having the adhesive layer including the A layer and the B layer that satisfies the above relaxation time (T 2s ), it is easy to achieve a better balance between the suppression of component migration between the adhesive layer/sealing resin and the improvement of the surface shape. Followability.

於若干態樣中,上述A層藉由環氧系交聯劑交聯,上述B層藉由異氰酸酯系交聯劑交聯。此處所揭示之黏著片材可於具備此種構成之黏著劑層之態樣中較佳地實施。In some aspects, the above-mentioned layer A is cross-linked by an epoxy-based cross-linking agent, and the above-mentioned layer B is cross-linked by an isocyanate-based cross-linking agent. The adhesive sheet disclosed here can be preferably implemented in the form of an adhesive layer having such a structure.

於此處所揭示之黏著片材之若干態樣中,該黏著片材具備上述基材、配置於上述基材之單側之上述黏著劑層(第1黏著劑層)、及配置於上述基材之與上述黏著劑層相反一側之第2黏著劑層。由於此種構成之黏著片材例如可利用上述第2黏著劑層而固定於適當之載具上,於該狀態下進行上述第1黏著劑層上之樹脂密封步驟,故而可用性較佳。In some aspects of the adhesive sheet disclosed here, the adhesive sheet includes the above-mentioned base material, the above-mentioned adhesive layer (first adhesive layer) arranged on one side of the above-mentioned base material, and the above-mentioned adhesive layer arranged on one side of the above-mentioned base material. The second adhesive layer on the opposite side to the above-mentioned adhesive layer. Since the adhesive sheet with such a structure can be fixed on an appropriate carrier using the second adhesive layer, and the resin sealing step on the first adhesive layer is performed in this state, it has better usability.

於若干態樣中,上述第2黏著劑層之至少表面包含含有熱膨脹性微小球之黏著劑。該態樣之黏著片材視需要進行適當時間之加熱而使上述熱膨脹性微小球膨脹,藉此可容易解除上述第2黏著劑層與被黏著體之接合,故而較佳。In some aspects, at least the surface of the second adhesive layer includes an adhesive containing thermally expandable microspheres. This aspect of the adhesive sheet is preferably heated for an appropriate period of time to expand the thermally expandable microballoons, thereby easily releasing the bond between the second adhesive layer and the adherend.

再者,將本說明書中所記載之各要素進行適當組合所得者亦可包含於藉由本案專利申請求得專利保護之發明範圍中。Furthermore, what can be obtained by appropriately combining the various elements described in this specification may also be included in the scope of the invention that is protected by the patent application in this case.

以下,對本發明之較佳之實施方式進行說明。除本說明書中特別言及之事項以外之事情即實施本發明所需之事情可由業者基於本說明書所記載之關於發明之實施之教示及申請時之技術常識來理解。本發明可基於本說明書所揭示之內容及該領域中之技術常識進行實施。 再者,於以下之圖式中,有時對發揮相同作用之構件、部位標記相同符號進行說明,有時省略或簡化重複之說明。又,圖式所記載之實施方式係為了明確說明本發明而模式化,未必準確地表示實際上所提供之製品之尺寸或縮小比例。 Preferred embodiments of the present invention will be described below. Matters other than matters specifically mentioned in this specification, that is, matters necessary to implement the present invention, can be understood by those skilled in the art based on the teachings regarding the implementation of the invention described in this specification and the technical common sense at the time of filing. The present invention can be implemented based on the content disclosed in this specification and the technical common sense in this field. Furthermore, in the following drawings, members and parts that perform the same functions are sometimes labeled with the same symbols for description, and sometimes repeated descriptions are omitted or simplified. In addition, the embodiments described in the drawings are schematic in order to clearly explain the present invention, and do not necessarily accurately represent the dimensions or reduction ratio of the products actually provided.

於該說明書中,黏著劑之「基礎聚合物」係指該黏著劑中所含之橡膠狀聚合物之主成分,除此以外,並不受任何限定地進行解釋。上述橡膠狀聚合物係指在室溫附近之溫度區域中表現橡膠彈性之聚合物。又,於該說明書中,「主成分」只要沒有特別說明,則係指以超過50重量%之形式所包含之成分。 又,於該說明書中,「丙烯酸系聚合物」係指包含來自1分子中具有至少1個(甲基)丙烯醯基之單體之單體單元作為構成該聚合物之單體單元的聚合物。以下,亦將1分子中具有至少1個(甲基)丙烯醯基之單體稱為「丙烯酸系單體」。因此,該說明書中之丙烯酸系聚合物被定義為包含來自丙烯酸系單體之單體單元之聚合物。作為丙烯酸系聚合物之典型例,可例舉:該丙烯酸系聚合物之合成中所使用之所有單體中的丙烯酸系單體之比例超過50重量%(較佳為超過70重量%,例如超過90重量%)之聚合物。以下,亦將聚合物之合成中所使用之單體稱為構成該聚合物之單體成分。 又,於該說明書中,「(甲基)丙烯醯基」係包括性地指丙烯醯基及甲基丙烯醯基之含義。同樣地,「(甲基)丙烯酸酯」係包括性地指丙烯酸酯及甲基丙烯酸酯之含義,「(甲基)丙烯酸」係包括性地指丙烯酸及甲基丙烯酸之含義。因此,此處所稱之丙烯酸系單體之概念中可包含具有丙烯醯基之單體(丙烯酸系單體)及具有甲基丙烯醯基之單體(甲基丙烯酸系單體)該兩者。 In this specification, the "base polymer" of the adhesive refers to the main component of the rubber-like polymer contained in the adhesive, and other than that, it is not to be interpreted in any way. The above-mentioned rubber-like polymer refers to a polymer that exhibits rubber elasticity in a temperature range near room temperature. In addition, in this specification, the "main ingredient" refers to the ingredient contained in more than 50% by weight unless otherwise specified. In addition, in this specification, "acrylic polymer" refers to a polymer containing a monomer unit derived from a monomer having at least one (meth)acrylyl group per molecule as a monomer unit constituting the polymer. . Hereinafter, a monomer having at least one (meth)acrylyl group in one molecule is also referred to as an "acrylic monomer". Therefore, an acrylic polymer in this specification is defined as a polymer containing monomer units derived from acrylic monomers. Typical examples of acrylic polymers include: the proportion of acrylic monomers in all monomers used in the synthesis of the acrylic polymer exceeds 50% by weight (preferably exceeds 70% by weight, for example, exceeds 90% by weight) polymer. Hereinafter, the monomers used in the synthesis of the polymer are also referred to as monomer components constituting the polymer. In addition, in this specification, "(meth)acrylyl group" means an acrylyl group and a methacrylyl group inclusively. Similarly, "(meth)acrylate" refers to acrylate and methacrylate inclusively, and "(meth)acrylic acid" refers to acrylic acid and methacrylic acid inclusively. Therefore, the concept of the acrylic monomer here can include both a monomer having an acrylic group (acrylic monomer) and a monomer having a methacrylic group (methacrylic monomer).

<黏著片材之概要> 此處所揭示之黏著片材可較佳地用作對半導體晶片進行樹脂密封時之暫時固定材。更詳細而言,關於本發明之黏著片材,當將半導體晶片排列在該黏著片材之黏著劑層上,利用密封樹脂(通常為環氧系樹脂)覆蓋該半導體晶片,藉由使該密封樹脂硬化而對半導體晶片進行樹脂密封時,本發明之黏著片材可用作該半導體晶片之暫時固定材。當對半導體晶片樹脂密封後,進行特定之後續步驟(例如,密封樹脂之背面研磨、圖案形成、凸塊形成、晶片化(切斷))時,上述黏著片材可自包含密封樹脂及半導體晶片之構造體剝離。密封樹脂之環氧當量例如為50 g/eq~500 g/eq。 <Overview of adhesive sheets> The adhesive sheet disclosed here can be preferably used as a temporary fixing material when resin sealing a semiconductor chip. More specifically, regarding the adhesive sheet of the present invention, when a semiconductor chip is arranged on the adhesive layer of the adhesive sheet, the semiconductor chip is covered with a sealing resin (usually an epoxy resin), so that the sealing When the resin is hardened and the semiconductor chip is resin-sealed, the adhesive sheet of the present invention can be used as a temporary fixing material for the semiconductor chip. When the semiconductor wafer is sealed with resin and specific subsequent steps are performed (for example, back grinding of the sealing resin, pattern formation, bump formation, wafering (cutting)), the above-mentioned adhesive sheet can self-contain the sealing resin and the semiconductor wafer. The structure is peeled off. The epoxy equivalent of the sealing resin is, for example, 50 g/eq to 500 g/eq.

圖1係表示此處所揭示之黏著片材之一實施方式之概略截面圖。黏著片材100具備基材10、及配置於基材10之單側之黏著劑層(第1黏著劑層)20。關於該黏著片材100,黏著劑層(第1黏著劑層)20之表面、即測定位置A(圖1之箭頭A)處之壓痕硬度H1為0.10 MPa以上,且於黏著片材100之截面中在自基材10向黏著劑層20之表面側距離4 μm之位置(圖1中箭頭B所示之測定位置B)處所測得之壓痕硬度H2為0.09 MPa以下。FIG. 1 is a schematic cross-sectional view showing one embodiment of the adhesive sheet disclosed here. The adhesive sheet 100 includes a base material 10 and an adhesive layer (first adhesive layer) 20 arranged on one side of the base material 10 . Regarding this adhesive sheet 100, the indentation hardness H1 of the surface of the adhesive layer (first adhesive layer) 20, that is, the measurement position A (arrow A in Figure 1) is 0.10 MPa or more, and is at least 0.10 MPa. The indentation hardness H2 measured at a position 4 μm away from the base material 10 to the surface side of the adhesive layer 20 in the cross section (measurement position B indicated by arrow B in Figure 1) is 0.09 MPa or less.

黏著片材100可例如圖2所示用於半導體晶片之樹脂密封。首先,將複數個半導體晶片1貼合於黏著片材100之黏著劑層(第1黏著劑層)上(步驟(i)),其次,利用密封樹脂之半硬化物2'覆蓋半導體晶片1(步驟(ii)),藉由使該半硬化物2'硬化而利用密封樹脂2密封半導體晶片1(步驟(iii))。上述半硬化物2'例如可使用包含萘型2官能環氧樹脂(環氧當量:144)之組合物形成。其後,當進行特定之後續步驟時,自包含半導體晶片1及密封樹脂2之構造體50剝離黏著片材100(步驟(iv))。The adhesive sheet 100 may be used for resin sealing of semiconductor wafers as shown in FIG. 2 . First, a plurality of semiconductor wafers 1 are bonded to the adhesive layer (first adhesive layer) of the adhesive sheet 100 (step (i)). Secondly, the semiconductor wafers 1 are covered with the semi-hardened product 2' of the sealing resin (step (i)). Step (ii)): Curing the semi-hardened material 2' to seal the semiconductor wafer 1 with the sealing resin 2 (step (iii)). The semi-hardened product 2' can be formed using a composition containing a naphthalene-type bifunctional epoxy resin (epoxy equivalent: 144), for example. Thereafter, when a specific subsequent step is performed, the adhesive sheet 100 is peeled off from the structure 50 including the semiconductor chip 1 and the sealing resin 2 (step (iv)).

關於此處所揭示之黏著片材,藉由使測定位置A處之壓痕硬度H1為0.10 MPa以上,而使得在圖2所示之步驟(iv)中構造體50上不易產生糊劑殘留。又,藉由使黏著劑層之內部、具體而言測定位置B處之壓痕硬度H2為0.09 MPa以下,可使該黏著劑層良好地追隨於被黏著體之表面形狀(例如,可存在於半導體晶片1之黏著劑層側表面之金屬配線等所引起之階差),可防止產生密封樹脂2侵入至黏著片材與半導體晶片1之界面之缺陷(模型溢料)。Regarding the adhesive sheet disclosed here, by setting the indentation hardness H1 at the measurement position A to be 0.10 MPa or more, paste residue is less likely to occur on the structure 50 in step (iv) shown in FIG. 2 . In addition, by setting the indentation hardness H2 inside the adhesive layer, specifically at the measurement position B, to be 0.09 MPa or less, the adhesive layer can be made to follow the surface shape of the adherend well (for example, it can be present in The step difference caused by the metal wiring on the side surface of the adhesive layer of the semiconductor chip 1) can prevent the occurrence of defects (model flash) in which the sealing resin 2 invades the interface between the adhesive sheet and the semiconductor chip 1.

圖3係表示此處所揭示之黏著片材之另一實施方式之概略截面圖。作為黏著片材200,圖1所示之黏著片材100中之黏著劑層20包含構成黏著劑層20之表面(黏著面)之A層22、及配置於A層22與基材10之間且與基材10鄰接之B層24。根據此種構造之黏著劑層20,容易將測定位置A處之壓痕硬度H1及測定位置B處之壓痕硬度H2分別調節至適當範圍。此處所揭示之黏著片材可如此以在基材10之至少單面具備包含A層22及B層24之黏著劑層20之態樣較佳地實施。FIG. 3 is a schematic cross-sectional view showing another embodiment of the adhesive sheet disclosed here. As the adhesive sheet 200, the adhesive layer 20 in the adhesive sheet 100 shown in FIG. 1 includes the A layer 22 constituting the surface (adhesive surface) of the adhesive layer 20, and is disposed between the A layer 22 and the base material 10. And the B layer 24 is adjacent to the base material 10 . According to the adhesive layer 20 having such a structure, it is easy to adjust the indentation hardness H1 at the measurement position A and the indentation hardness H2 at the measurement position B to appropriate ranges respectively. The adhesive sheet disclosed here can be preferably implemented in such a manner that the adhesive layer 20 including the A layer 22 and the B layer 24 is provided on at least one side of the base material 10 .

圖4係表示此處所揭示之黏著片材之另一實施方式之概略截面圖。黏著片材300於基材10之背面側(與黏著劑層20相反一側)進而具備第2黏著劑層30。即,黏著片材300依次具備黏著劑層20、基材10、及第2黏著劑層30。藉由具備第2黏著劑層30,而當在載具上進行樹脂密封時,可藉由將第2黏著劑層30側貼合於該載具,而容易地將黏著片材300固定於載具。FIG. 4 is a schematic cross-sectional view showing another embodiment of the adhesive sheet disclosed here. The adhesive sheet 300 further includes a second adhesive layer 30 on the back side of the base material 10 (the side opposite to the adhesive layer 20). That is, the adhesive sheet 300 is provided with the adhesive layer 20, the base material 10, and the 2nd adhesive layer 30 in this order. By having the second adhesive layer 30, when performing resin sealing on the carrier, the adhesive sheet 300 can be easily fixed to the carrier by attaching the second adhesive layer 30 side to the carrier. Tool.

於若干實施方式中,第2黏著劑層之至少表面包含含有熱膨脹性微小球之黏著劑。此種包含熱膨脹性微小球之黏著劑層藉由加熱至特定溫度以上,可使上述熱膨脹性微小球膨脹,使上述黏著劑層之表面產生凹凸,使黏著力降低或消失。藉由用包含熱膨脹性微小球之黏著劑構成第2黏著劑層之至少表面,當經由該第2黏著劑層固定黏著片材(例如,固定於載具)時,可表現所需之黏著性,當剝離黏著片材時(例如,自上述載具剝離時),可利用加熱使黏著力降低或消失,藉此表現良好之剝離性。亦可於包含熱膨脹性微小球之黏著劑層與基材之間配置不包含熱膨脹性微小球或熱膨脹性微小球之含量較少之彈性中間層(可為黏著劑層)。In some embodiments, at least the surface of the second adhesive layer includes an adhesive containing thermally expandable microspheres. By heating the adhesive layer containing thermally expandable microspheres above a specific temperature, the thermally expandable microspheres can expand, causing unevenness on the surface of the adhesive layer, thereby reducing or disappearing the adhesive force. By forming at least the surface of the second adhesive layer with an adhesive containing thermally expandable microspheres, the required adhesiveness can be expressed when the adhesive sheet is fixed (for example, fixed to a carrier) through the second adhesive layer. , when peeling off the adhesive sheet (for example, when peeling off from the above-mentioned carrier), heating can be used to reduce or disappear the adhesive force, thereby exhibiting good peelability. An elastic intermediate layer (which may be an adhesive layer) that does not contain thermally expandable microspheres or has a small content of thermally expandable microspheres can also be disposed between the adhesive layer containing thermally expandable microspheres and the substrate.

(壓痕硬度) 關於此處所揭示之黏著片材之壓痕硬度H1,就對糊劑殘留之抑制之觀點而言,黏著片材之壓痕硬度H1為0.10 MPa以上(例如超過0.10 MPa)較為適當,較佳為0.12 MPa以上。於若干態樣中,壓痕硬度H1亦可為0.15 MPa以上,亦可為0.18 MPa以上,亦可為0.20 MPa以上。關於壓痕硬度H1較高之黏著劑層,一般而言,於實施將半導體晶片配置於該黏著劑層上並利用樹脂密封該半導體晶片之步驟的使用態樣中,就抑制可在半導體晶片與密封樹脂之邊界產生之階差(間隙)之觀點而言,壓痕硬度H1較高之黏著劑層亦有較為有利之傾向。又,壓痕硬度H1為0.50 MPa以下較為適當,較佳為0.40 MPa以下。就容易表現對被黏著體表面之密接性、或黏著劑層表面中之適度黏性之觀點而言,於若干態樣中,壓痕硬度H1例如可為0.30 MPa以下,亦可為0.28 MPa以下,亦可為0.25 MPa以下,亦可為0.23 MPa以下,亦可為0.21 MPa以下。 (indentation hardness) Regarding the indentation hardness H1 of the adhesive sheet disclosed here, from the viewpoint of suppressing paste residue, it is more appropriate for the indentation hardness H1 of the adhesive sheet to be 0.10 MPa or more (for example, more than 0.10 MPa), and preferably 0.12 MPa or above. In certain aspects, the indentation hardness H1 may be 0.15 MPa or more, 0.18 MPa or more, or 0.20 MPa or more. Regarding the adhesive layer with a high indentation hardness H1, generally speaking, in the use mode of carrying out the steps of arranging the semiconductor wafer on the adhesive layer and sealing the semiconductor wafer with resin, it is suppressed that the semiconductor wafer and the adhesive layer can be separated. From the perspective of the step (gap) generated at the boundary of the sealing resin, an adhesive layer with a higher indentation hardness H1 tends to be more advantageous. In addition, the indentation hardness H1 is suitably 0.50 MPa or less, preferably 0.40 MPa or less. From the viewpoint of easily expressing adhesion to the surface of the adherend or moderate viscosity on the surface of the adhesive layer, in some aspects, the indentation hardness H1 may be, for example, 0.30 MPa or less or 0.28 MPa or less. , it may be 0.25 MPa or less, it may be 0.23 MPa or less, or it may be 0.21 MPa or less.

關於此處所揭示之黏著片材之壓痕硬度H2,低於上述壓痕硬度H1較為適當,就提高對被黏著體之表面形狀之追隨性之觀點而言,黏著片材之壓痕硬度H2較佳為0.090 MPa以下。就獲得更高之追隨性之觀點而言,於若干態樣中,壓痕硬度H2亦可為0.080 MPa以下,亦可為0.060 MPa以下,亦可為0.050 MPa以下。壓痕硬度H2之下限例如可為0.001 MPa以上,並無特別限制。就防止黏著劑層內部之凝集破壞之觀點而言,於若干態樣中,壓痕硬度H2為0.005 MPa以上較為適當,較佳為0.010 MPa以上,亦可為0.030 MPa以上,亦可為0.040 MPa以上,亦可為0.050 MPa以上,亦可為0.060 MPa以上。Regarding the indentation hardness H2 of the adhesive sheet disclosed here, it is more appropriate to be lower than the above-mentioned indentation hardness H1. From the perspective of improving the ability to follow the surface shape of the adherend, the indentation hardness H2 of the adhesive sheet is lower than the above-mentioned indentation hardness H1. Preferably, it is below 0.090 MPa. From the viewpoint of obtaining higher followability, in some aspects, the indentation hardness H2 may be 0.080 MPa or less, 0.060 MPa or less, or 0.050 MPa or less. The lower limit of the indentation hardness H2 may be, for example, 0.001 MPa or more, and is not particularly limited. From the viewpoint of preventing aggregation damage inside the adhesive layer, in some aspects, the indentation hardness H2 is more appropriately 0.005 MPa or more, preferably 0.010 MPa or more, and may be 0.030 MPa or more, or 0.040 MPa. Above, it may be 0.050 MPa or above, or 0.060 MPa or above.

上述壓痕硬度H2[MPa]相對於上述壓痕硬度H1[MPa]之比(H2/H1)例如為0.90以下較為適當,較佳為0.70以下,亦可為0.50以下,亦可為0.40以下,亦可為0.30以下。又,上述比(H2/H1)例如為0.002以上較為適當,較佳為0.005以上,更佳為0.01以上。根據上述比(H2/H1)處於此種範圍之黏著片材,容易平衡性良好地兼顧糊劑殘留之抑制及對表面形狀之追隨性。The ratio (H2/H1) of the above-mentioned indentation hardness H2 [MPa] to the above-mentioned indentation hardness H1 [MPa] is suitably 0.90 or less, for example, preferably 0.70 or less, 0.50 or less, or 0.40 or less. It can also be below 0.30. Moreover, the said ratio (H2/H1) is suitably 0.002 or more, for example, Preferably it is 0.005 or more, More preferably, it is 0.01 or more. An adhesive sheet with the ratio (H2/H1) in this range can easily achieve a well-balanced combination of suppression of paste residue and ability to follow surface shapes.

(拉絲性) 於此處所揭示之黏著片材中,測定位置A處之拉絲性D1之範圍例如可為800 nm以下,並無特別限定。於若干態樣中,就提高糊劑殘留防止性之觀點而言,拉絲性D1為500 nm以下較為適當,較佳為300 nm以下,亦可為250 nm以下,亦可為200 nm以下,亦可為150 nm以下。又,就在黏著劑層表面中發揮適度黏性,例如容易將半導體晶片配置於該黏著劑層表面之觀點而言,拉絲性D1為50 nm以上較為適當,亦可為80 nm以上,亦可為100 nm以上,亦可為120 nm以上。 (drawn) In the adhesive sheet disclosed here, the range of the drawability D1 at the measurement position A can be, for example, 800 nm or less, and is not particularly limited. In some aspects, from the viewpoint of improving the prevention of paste residue, it is more appropriate for the stringiness D1 to be 500 nm or less, preferably 300 nm or less, or 250 nm or less, or 200 nm or less, or Can be below 150 nm. In addition, from the viewpoint of exerting moderate viscosity on the surface of the adhesive layer, for example, making it easy to place a semiconductor chip on the surface of the adhesive layer, the stringiness D1 is preferably 50 nm or more, and may be 80 nm or more. It is above 100 nm, and it can also be above 120 nm.

於此處所揭示之黏著片材中,測定位置B處之拉絲性D2之範圍例如可為100 nm以上,並無特別限定,就提高對被黏著體之表面形狀之追隨性之觀點而言,拉絲性D2較佳為150 nm以上,更佳為200 nm以上。於若干態樣中,拉絲性D2亦可為300 nm以上,亦可為400 nm以上,亦可為500 nm以上。又,拉絲性D2例如可為2500 nm以下,就防止黏著劑層內部之凝集破壞之觀點而言,拉絲性D2較佳為1500 nm以下,更佳為1000 nm以下,亦可為800 nm以下,亦可為600 nm以下。In the adhesive sheet disclosed here, the range of the drawability D2 at the measurement position B can be, for example, 100 nm or more, and is not particularly limited. From the perspective of improving the ability to follow the surface shape of the adherend, the drawability The property D2 is preferably 150 nm or more, and more preferably 200 nm or more. In certain aspects, the drawability D2 may be above 300 nm, above 400 nm, or above 500 nm. In addition, the stringability D2 may be, for example, 2500 nm or less. From the viewpoint of preventing aggregation damage inside the adhesive layer, the stringiness D2 is preferably 1500 nm or less, more preferably 1000 nm or less, and may also be 800 nm or less. It can also be below 600 nm.

上述拉絲性D2[nm]相對於上述拉絲性D1[nm]之比(D2/D1)例如可為0.3以上,亦可為0.5以上,亦可為1.0以上。於若干態樣中,上述比(D2/D1)較佳為超過1.0(例如1.2以上),亦可為2.5以上,亦可為3.5以上,亦可為5.0以上。又,上述比(D2/D1)例如為20.0以下較為適當,為15.0以下較為有利,較佳為10.0以下,亦可為8.0以下,亦可為7.0以下,亦可為6.0以下。根據比(D2/D1)處於由上述任一上限與下限之組合所規定之範圍內之黏著片材,容易平衡性良好地兼顧糊劑殘留之抑制及對表面形狀之追隨性。The ratio (D2/D1) of the stringability D2 [nm] to the stringability D1 [nm] (D2/D1) may be, for example, 0.3 or more, 0.5 or more, or 1.0 or more. In certain aspects, the above ratio (D2/D1) is preferably more than 1.0 (for example, more than 1.2), may be more than 2.5, may be more than 3.5, may also be more than 5.0. Moreover, the said ratio (D2/D1) is suitably 20.0 or less, for example, 15.0 or less is more advantageous, Preferably it is 10.0 or less, It may be 8.0 or less, It may be 7.0 or less, It may be 6.0 or less. An adhesive sheet whose ratio (D2/D1) is within the range specified by any combination of the above upper and lower limits can easily achieve a well-balanced combination of suppression of paste residue and ability to follow the surface shape.

關於壓痕硬度H1、H2及拉絲性D1、D2,使用奈米壓痕儀,於特定之測定位置處,將壓頭自樣品之表面垂直壓入至特定深度,其次,進行拔出之操作,此時,將對上述壓頭所施加之負載(縱軸)之推移相對於將上述樣品之表面作為基準之壓頭之位移(橫軸)進行繪製,根據藉此獲得之負荷(壓入)-卸載(拔出)曲線求出壓痕硬度H1、H2及拉絲性D1、D2。此處,於壓痕硬度H1及拉絲性D1之測定中,將黏著劑層之表面設為測定位置(測定位置A)。於壓痕硬度H2及拉絲性D2之測定中,將黏著片材之截面中自基材向黏著劑層之表面側距離4 μm之位置設為測定位置(測定位置B)。Regarding the indentation hardness H1, H2 and drawability D1, D2, use a nanoindentation instrument to press the indenter vertically from the surface of the sample to a specific depth at a specific measurement position, and then pull it out. At this time, the change of the load (vertical axis) applied by the above-mentioned indenter is plotted against the displacement (horizontal axis) of the indenter using the surface of the above-mentioned sample as a reference, and based on the load (pressure) thus obtained - The indentation hardness H1, H2 and the drawability D1, D2 were obtained from the unloading (pull-out) curve. Here, in the measurement of the indentation hardness H1 and the drawability D1, the surface of the adhesive layer was set as the measurement position (measurement position A). In the measurement of the indentation hardness H2 and the drawability D2, the position 4 μm away from the base material to the surface side of the adhesive layer in the cross section of the adhesive sheet was set as the measurement position (measurement position B).

關於壓痕硬度[MPa],可藉由用將壓頭壓入特定深度時之負荷曲線之最大負載(Pmax)[μN]除以該壓頭之接觸投影面積(A)、即下式:壓痕硬度[MPa]=Pmax/A而求出壓痕硬度[MPa]。壓痕硬度可藉由對黏著劑層之構造或構成該黏著劑層之黏著劑之組成(例如,基礎聚合物之組成、交聯之程度、交聯劑之種類等)進行適當選擇而設為上述範圍。Regarding the indentation hardness [MPa], the maximum load (Pmax) [μN] of the load curve when the indenter is pressed into a specific depth is divided by the contact projected area (A) of the indenter, that is, the following formula: Indentation The indentation hardness [MPa] is obtained by calculating the indentation hardness [MPa]=Pmax/A. The indentation hardness can be set by appropriately selecting the structure of the adhesive layer or the composition of the adhesive constituting the adhesive layer (for example, the composition of the base polymer, the degree of cross-linking, the type of cross-linking agent, etc.) the above range.

拉絲性[nm]如圖5模式性所示,可被定義為卸載曲線在負位移側成為零負載時之位移量。拉絲性可藉由對構成黏著劑層之黏著劑之組成(例如,基礎聚合物之組成、交聯之程度、交聯劑之種類等)進行適當選擇而設為上述範圍。Drawnability [nm] is schematically shown in Figure 5 and can be defined as the displacement amount when the unloading curve becomes zero load on the negative displacement side. The stringiness can be set within the above range by appropriately selecting the composition of the adhesive constituting the adhesive layer (for example, the composition of the base polymer, the degree of cross-linking, the type of cross-linking agent, etc.).

關於壓痕硬度及拉絲性,具體而言,可使用Hysitron公司製造之奈米壓痕儀、製品名「Triboindenter TI-950」或其對應體,於以下之條件下進行測定。 [測定條件] 使用壓頭:Berkovich(三角錐)型金剛石壓頭 測定方法:單一壓入測定 測定溫度:室溫(25℃) 壓入深度設定:於測定位置A處為800 nm, 於測定位置B處為1000 nm 壓入速度:200 nm/秒 拔出速度:200 nm/秒 Regarding the indentation hardness and drawability, specifically, the nanoindentation instrument manufactured by Hysitron Corporation, product name "Triboindenter TI-950" or its equivalent can be measured under the following conditions. [Measurement conditions] Indenter used: Berkovich (triangular pyramid) type diamond indenter Measuring method: single intrusion measurement Measuring temperature: room temperature (25℃) Intrusion depth setting: 800 nm at measurement position A, 1000 nm at measurement position B Pressing speed: 200 nm/second Pull-out speed: 200 nm/second

(膨潤性) 於此處所揭示之黏著片材之若干態樣中,上述黏著劑層(第1黏著劑層)之初始厚度T0[μm]與將4-第三丁基苯基縮水甘油醚(TBPGE)滴下至上述黏著劑層之表面並靜置1分鐘後的該黏著劑層之厚度T1[μm]之差(T1-T0)、即厚度變化量為20 μm以下。關於具備由TBPGE之膨潤所引起之厚度變化量較小之黏著劑層之黏著片材,例如於在該黏著劑層上進行半導體晶片之樹脂密封之使用態樣中,有黏著劑層/密封樹脂間之成分移行受到抑制之傾向,藉此,可抑制半導體晶片與密封樹脂之階差(間隙)。就該觀點而言,於若干態樣中,上述厚度變化量較佳為15 μm以下,更佳為10 μm以下。上述厚度變化量越接近0(零)μm越好,亦可為0 μm。於若干態樣中,就與其他特性之平衡或成本等實用上之觀點而言,上述厚度變化量例如可為0.1 μm以上,亦可為0.5 μm以上,亦可為1 μm以上,亦可為2 μm以上或3 μm以上。 (swellability) In some aspects of the adhesive sheet disclosed here, the initial thickness T0 [μm] of the above-mentioned adhesive layer (first adhesive layer) is determined by dropping 4-tert-butylphenyl glycidyl ether (TBPGE) to The difference (T1-T0) in the thickness T1 [μm] of the adhesive layer after it has been left standing for 1 minute on the surface of the above-mentioned adhesive layer, that is, the thickness change is 20 μm or less. Regarding an adhesive sheet having an adhesive layer with a small change in thickness due to swelling of TBPGE, for example, in the usage state of performing resin sealing of semiconductor wafers on the adhesive layer, there is an adhesive layer/sealing resin. The tendency of component migration between them is suppressed, thereby suppressing the step difference (gap) between the semiconductor chip and the sealing resin. From this point of view, in some aspects, the above-mentioned thickness variation is preferably 15 μm or less, more preferably 10 μm or less. The closer the above-mentioned thickness variation is to 0 (zero) μm, the better, and it may also be 0 μm. In some aspects, from a practical viewpoint such as a balance with other characteristics or cost, the thickness variation may be, for example, 0.1 μm or more, 0.5 μm or more, 1 μm or more, or 1 μm or more. 2 μm or more or 3 μm or more.

於此處所揭示之黏著片材之若干態樣中,將TBPGE滴下至該黏著片材之黏著劑層表面並靜置1分鐘後的該黏著劑層之厚度變化率較佳為160%以下,更佳為150%以下。關於具備由TBPGE之膨潤所引起之厚度變化率受到抑制之黏著劑層之黏著片材,例如於在該黏著劑層上進行半導體晶片之樹脂密封之使用態樣中,有黏著劑層/密封樹脂間之成分移行受到抑制之傾向,藉此可抑制間隙。就該觀點而言,於若干態樣中,上述厚度變化率例如可為120%以下,亦可為100%以下,亦可為80%以下,亦可為60%以下。上述厚度變化率越小越好,其下限並無特別限制。於若干態樣中,就與其他特性之平衡或成本等實用上之觀點而言,上述厚度變化率例如可為5%以上,亦可為10%以上,亦可為20%以上。In some aspects of the adhesive sheet disclosed here, the thickness change rate of the adhesive layer after dropping TBPGE onto the surface of the adhesive layer of the adhesive sheet and leaving it for 1 minute is preferably less than 160%, and more preferably The best is less than 150%. For an adhesive sheet having an adhesive layer that suppresses the thickness change rate caused by swelling of TBPGE, for example, in a usage state where a semiconductor chip is resin-sealed on the adhesive layer, there is an adhesive layer/sealing resin. The tendency of the component migration between the components to be inhibited, thereby suppressing the gap. From this point of view, in certain aspects, the thickness change rate may be, for example, 120% or less, 100% or less, 80% or less, or 60% or less. The smaller the thickness change rate, the better, and the lower limit is not particularly limited. In some aspects, from a practical viewpoint such as a balance with other characteristics or cost, the thickness change rate may be, for example, 5% or more, 10% or more, or 20% or more.

關於上述厚度變化量,將特定量(使用22 mm直徑之注射器,0.02 g)之TBPGE滴下至黏著劑層之表面,於23℃50%RH之環境下放置1分鐘,擦除殘留在黏著劑層表面之TBPGE,可根據擦除後之滴下TBPGE之部位處之黏著劑層之厚度T1、與TBPGE滴下前之該部位之黏著劑層之厚度(初始厚度)T0並藉由T1-T0之式求出上述厚度變化量。關於上述厚度變化率,可根據上述T0及T1並藉由(T1-T0)/T0之式求出。上述厚度變化量及厚度變化率例如可藉由對構成黏著劑層之至少表面之A層之基礎聚合物(例如丙烯酸系聚合物)之組成或交聯之程度、交聯劑之種類等進行適當選擇而設為上述範圍。例如,藉由將構成上述丙烯酸系聚合物之單體成分之30重量%以上(更佳為40重量%以上)設為酯末端具有碳數較多(例如4以上,較佳為8以上)之烷基的(甲基)丙烯酸烷基酯,可形成厚度變化量及/或厚度變化率較小之黏著劑層。Regarding the above thickness change, drop a specific amount (using a 22 mm diameter syringe, 0.02 g) of TBPGE onto the surface of the adhesive layer, place it in an environment of 23°C and 50% RH for 1 minute, and wipe away the remaining residue on the adhesive layer. The TBPGE on the surface can be calculated based on the thickness T1 of the adhesive layer at the location where TBPGE was dropped after erasing, and the thickness (initial thickness) T0 of the adhesive layer at the location before TBPGE was dropped, and by the formula T1-T0. Find the above thickness change. The thickness change rate can be obtained by the equation (T1-T0)/T0 based on the above-mentioned T0 and T1. The above-mentioned thickness change amount and thickness change rate can be appropriately determined by, for example, the composition of the base polymer (for example, an acrylic polymer) constituting at least the surface A layer of the adhesive layer, the degree of cross-linking, the type of cross-linking agent, etc. Select and set to the above range. For example, by making 30% by weight or more (more preferably 40% by weight or more) of the monomer components constituting the acrylic polymer have an ester terminal having a large number of carbon atoms (for example, 4 or more, preferably 8 or more). Alkyl (meth)acrylate can form an adhesive layer with a small thickness change and/or a small thickness change rate.

(TMA沉入量) 於此處所揭示之黏著片材之若干態樣中,該黏著片材之使用TMA所得之23℃環境下之沉入量可為大概20.0 μm以下(例如,大概1.00 μm以上20.0 μm以下)。此處,「黏著片材之使用TMA所得之23℃環境下之沉入量」(以下,亦稱為「TMA沉入量」)意指使用熱機械分析裝置(Thermomechanical Analyzer;TMA),使探針與黏著劑層(第1黏著劑層)接觸並經過60分鐘後之沉入量。TMA沉入量之測定條件設為:探針:針入(圓柱狀,前端直徑1 mmΦ)、氮氣流量:50.0 ml/min、壓入負載:0.01 N。作為熱機械分析裝置,可使用TA instruments公司製造之製品名「TMA Q400」、或其對應體。 (TMA sinking amount) In some aspects of the adhesive sheet disclosed herein, the sinking amount of the adhesive sheet using TMA in a 23°C environment can be approximately 20.0 μm or less (for example, approximately 1.00 μm or more and 20.0 μm or less). Here, "the sinking amount of the adhesive sheet obtained by using TMA in a 23°C environment" (hereinafter, also referred to as "TMA sinking amount") means using a thermomechanical analyzer (Thermomechanical Analyzer; TMA). The amount of needle sinking after 60 minutes of contact with the adhesive layer (first adhesive layer). The measurement conditions for the TMA sinking amount are as follows: probe: needle insertion (cylindrical, tip diameter 1 mmΦ), nitrogen gas flow: 50.0 ml/min, and pressing load: 0.01 N. As a thermomechanical analysis device, product name "TMA Q400" manufactured by TA Instruments Co., Ltd. or its equivalent can be used.

再者,於黏著片材僅在基材之單側具有黏著劑層之情形時(即,於不具有下述第2黏著劑層之情形時),於在基材之與黏著劑層(第1黏著劑層)相反一側之面設置標準黏著劑層後,進行上述測定。上述標準黏著劑層係使用將丙烯酸系聚合物(包含丙烯酸乙酯(EA)/丙烯酸2-乙基己酯(2EHA)/甲基丙烯酸甲酯(MMA)/丙烯酸2-羥基乙酯(HEA)=30/70/5/5(重量比)之單體成分之丙烯酸系聚合物。重量平均分子量45萬)100重量份、黏著賦予劑(Yasuhara Chemical公司製造,商品名「MightyAce G125」)10重量份、異氰酸酯系交聯劑(東曹公司製造,商品名「Coronate L」)2重量份、熱膨脹性微小球(松本油脂製藥公司製造,商品名「Matsumoto Microsphere F-190D」)30重量份、及甲苯加以混合所獲得之黏著劑組合物所形成的厚度45 μm之黏著劑層。Furthermore, when the adhesive sheet has an adhesive layer only on one side of the base material (that is, when it does not have the second adhesive layer described below), between the base material and the adhesive layer (the second adhesive layer) 1 Adhesive layer) After setting a standard adhesive layer on the opposite side, perform the above measurement. The above standard adhesive layer uses an acrylic polymer (including ethyl acrylate (EA)/2-ethylhexyl acrylate (2EHA)/methyl methacrylate (MMA)/2-hydroxyethyl acrylate (HEA) = Acrylic polymer with a monomer component of 30/70/5/5 (weight ratio). 100 parts by weight of a weight average molecular weight of 450,000, and 10 parts by weight of a tackifier (manufactured by Yasuhara Chemical Co., Ltd., trade name "MightyAce G125") parts, 2 parts by weight of an isocyanate cross-linking agent (manufactured by Tosoh Corporation, trade name "Coronate L"), 30 parts by weight of heat-expandable microspheres (manufactured by Matsumoto Oils & Fats Pharmaceutical Co., Ltd., trade name "Matsumoto Microsphere F-190D"), and The adhesive composition obtained by mixing toluene formed an adhesive layer with a thickness of 45 μm.

於若干態樣中,上述TMA沉入量較佳為15.0 μm以下,更佳為10.0 μm以下,亦可為9.00 μm以下,亦可為6.00 μm以下。關於TMA沉入量較小之黏著片材,例如於實施將半導體晶片配置於該黏著劑層上並利用樹脂密封該半導體晶片之步驟的使用態樣中,由在樹脂密封時(例如,於圖2之步驟(ii)及步驟(iii)中)對半導體晶片造成負荷之力所引起的半導體晶片嵌埋至黏著片材有變得更小之傾向。藉由使上述嵌埋變小,可在包含上述晶片及密封樹脂之構造體中,減少由該嵌埋所引起之半導體晶片與密封樹脂之階差(間隙)。關於減少上述階差,就提高自上述構造體剝離黏著片材時之糊劑殘留防止性之觀點而言,亦較佳減少上述階差。In certain aspects, the above-mentioned TMA sinking amount is preferably 15.0 μm or less, more preferably 10.0 μm or less, or 9.00 μm or less, or 6.00 μm or less. Regarding the adhesive sheet with a small amount of TMA sinking, for example, in the use mode of carrying out the step of arranging a semiconductor chip on the adhesive layer and sealing the semiconductor chip with resin, when sealing with resin (for example, as shown in FIG. The semiconductor chip embedded in the adhesive sheet tends to become smaller due to the force exerting load on the semiconductor chip in steps (ii) and (iii) of 2). By making the embedding smaller, the step (gap) between the semiconductor wafer and the sealing resin caused by the embedding can be reduced in the structure including the chip and the sealing resin. Regarding reducing the step difference, it is also preferable to reduce the step difference from the viewpoint of improving the prevention of paste residue when the adhesive sheet is peeled off from the structure.

於若干態樣中,就提高對被黏著體之表面形狀(例如,可存在於半導體晶片之表面之階差)之追隨性之觀點而言,上述TMA沉入量例如可為1.50 μm以上,為2.00 μm以上較為適當,亦可為2.50 μm以上,亦可為3.00 μm以上,亦可為3.50 μm以上。於表現此種TMA沉入量之黏著片材中,可較佳地兼顧對半導體晶片之表面形狀之追隨性、及對半導體晶片嵌埋至黏著片材之抑制。 TMA沉入量例如可藉由對黏著劑層之構造(厚度、層構成等)、構成該黏著劑層之黏著劑之基礎聚合物(例如丙烯酸系聚合物)之組成或交聯之程度、交聯劑之種類、基材之種類等進行適當選擇而設為上述範圍。 In some aspects, from the viewpoint of improving the ability to follow the surface shape of the adherend (for example, the step that may exist on the surface of a semiconductor wafer), the TMA sinking amount may be, for example, 1.50 μm or more, as 2.00 μm or more is more appropriate, and may be 2.50 μm or more, 3.00 μm or more, or 3.50 μm or more. In an adhesive sheet that exhibits such a sinking amount of TMA, it is possible to better achieve both the ability to follow the surface shape of the semiconductor wafer and the suppression of the semiconductor wafer being embedded in the adhesive sheet. The amount of TMA sinking can be determined, for example, by the structure (thickness, layer composition, etc.) of the adhesive layer, the composition of the base polymer (such as acrylic polymer) of the adhesive that constitutes the adhesive layer, or the degree of cross-linking. The type of coupling agent, the type of base material, etc. are appropriately selected and set within the above range.

於此處所揭示之黏著片材之若干態樣中,該黏著片材之使用TMA所得之在145℃環境下之沉入量(以下,亦可稱為「高溫TMA沉入量」)為2.00 μm以上60 μm以下較為適當,例如可為3.00 μm以上50 μm以下,亦可為4.00 μm以上40 μm以下。高溫TMA沉入量處於上述範圍之黏著片材於經過高溫環境(例如,樹脂密封時之加熱處理環境)之情形時,亦可較佳抑制半導體晶片嵌埋至黏著片材。關於高溫TMA沉入量,除了將測定氛圍溫度設為145℃以外,亦以與上述23℃環境下之TMA沉入量相同之方式進行測定。In some aspects of the adhesive sheet disclosed here, the sinking amount of the adhesive sheet obtained by using TMA in an environment of 145°C (hereinafter, may also be referred to as "high temperature TMA sinking amount") is 2.00 μm More than 60 μm and less than 60 μm are more appropriate, for example, they may be 3.00 μm or more and 50 μm or less, or they may be 4.00 μm or more and 40 μm or less. An adhesive sheet with a high-temperature TMA sinking amount within the above range can better prevent the semiconductor chip from being embedded in the adhesive sheet when it passes through a high-temperature environment (for example, a heat treatment environment during resin sealing). The high-temperature TMA sinking amount was measured in the same manner as the TMA sinking amount in the 23°C environment, except that the measurement atmosphere temperature was set to 145°C.

(探針黏性值) 於此處所揭示之黏著片材之若干態樣中,在上述黏著劑層(第1黏著劑層)之表面中所測得之探針黏性值較佳為50 N/5 mmϕ以上,更佳為75 N/5 mmϕ以上,進而較佳為100 N/5 mmϕ以上。關於探針黏性值處於此種範圍,就防止配置於上述黏著劑層上之被黏著體(例如,半導體晶片)之位置偏移之觀點而言,較佳為探針黏性值處於此種範圍。探針黏性值可使用市售之探針黏性試驗機,於23℃、50%RH之環境下,於探針區域之面積及材質:5 mmϕSUS(不鏽鋼)、探針下降速度:30 mm/min、密接負載:100 gf、密接保持時間:1秒、測試速度:30 mm/min之條件下進行測定。 (Probe viscosity value) In some aspects of the adhesive sheet disclosed here, the probe viscosity value measured on the surface of the above-mentioned adhesive layer (first adhesive layer) is preferably 50 N/5 mmϕ or more, more preferably It is 75 N/5 mmϕ or more, and it is more preferable that it is 100 N/5 mmϕ or more. When the probe viscosity value is in this range, from the viewpoint of preventing the positional shift of the adherend (for example, a semiconductor wafer) disposed on the adhesive layer, it is preferable that the probe viscosity value is in this range. Scope. The probe viscosity value can be measured using a commercially available probe viscosity testing machine, in an environment of 23°C, 50%RH, the area and material of the probe area: 5 mmϕSUS (stainless steel), and the probe descent speed: 30 mm /min, close contact load: 100 gf, close contact retention time: 1 second, test speed: 30 mm/min.

(對於PET之黏著力) 此處所揭示之黏著片材對於聚對苯二甲酸乙二酯膜之黏著力(對於PET之黏著力)例如可為5.00 N/20 mm以下,亦可為3.00 N/20 mm以下,亦可為2.00 N/20 mm以下,並無特別限定。於若干態樣中,就防止剝離黏著片材時之由負荷所引起之被黏著體之損傷之觀點而言,上述對於PET之黏著力較佳為1.00 N/20 mm以下,更佳為0.05 N/20 mm以下。又,於若干態樣中,關於黏著片材對於PET之黏著力,就較佳地固定被黏著體(例如,半導體晶片)之觀點而言,黏著片材對於PET之黏著力為0.03 N/20 mm以上較為適當,較佳為0.05 N/20 mm以上,亦可為0.10 N/20 mm以上,亦可為0.15 N/20 mm以上。 對於PET之黏著力係指,將作為被黏著體之PET膜(厚度25 μm)貼合(貼合條件:利用2 kg輥進行1個往返)於寬度20 mm、長度140 mm之黏著片材之黏著劑層(第1黏著劑層),於23℃之環境溫度下放置30分鐘後,進行拉伸試驗(剝離角度180度、拉伸速度300 mm/分鐘)所測得之黏著力。 (For the adhesion of PET) The adhesive force of the adhesive sheet disclosed here to the polyethylene terephthalate film (the adhesive force to PET) may be, for example, 5.00 N/20 mm or less, or 3.00 N/20 mm or less, or it may be 2.00 N/20 mm or less, no special limit. In some aspects, from the viewpoint of preventing damage to the adherend caused by load when peeling off the adhesive sheet, the above-mentioned adhesive force on PET is preferably 1.00 N/20 mm or less, and more preferably 0.05 N /20 mm or less. Furthermore, in some aspects, regarding the adhesive force of the adhesive sheet to PET, from the perspective of better fixing the adherend (for example, a semiconductor chip), the adhesive force of the adhesive sheet to PET is 0.03 N/20 mm or more is more appropriate, preferably 0.05 N/20 mm or more, 0.10 N/20 mm or more, or 0.15 N/20 mm or more. The adhesive force of PET means that the PET film (thickness 25 μm) as the adherend is bonded (laminated condition: 1 round trip using a 2 kg roller) on an adhesive sheet with a width of 20 mm and a length of 140 mm. The adhesive layer (first adhesive layer) was placed at an ambient temperature of 23°C for 30 minutes and then subjected to a tensile test (peel angle 180 degrees, tensile speed 300 mm/min) to measure the adhesive force.

(拉伸彈性模數) 於若干態樣中,第1黏著劑層之在25℃下之拉伸彈性模數較佳為未達100 MPa,更佳為0.1 MPa~50 MPa,進而較佳為0.1 MPa~10 MPa。若為此種範圍,則容易獲得上述第1黏著劑層發揮適當黏著力之黏著片材。再者,拉伸彈性模數可依據JISK7161:2008進行測定。 (tensile elastic modulus) In certain aspects, the tensile elastic modulus of the first adhesive layer at 25°C is preferably less than 100 MPa, more preferably 0.1 MPa~50 MPa, and further preferably 0.1 MPa~10 MPa. If it is within this range, it will be easy to obtain an adhesive sheet in which the first adhesive layer exhibits appropriate adhesive force. In addition, the tensile elastic modulus can be measured in accordance with JISK7161:2008.

<黏著劑層(第1黏著劑層)> 於此處所揭示之黏著片材中,作為構成配置於基材之至少單側之黏著劑層(第1黏著劑層)之黏著劑,只要能夠獲得本發明之效果,則可使用任意適當之黏著劑。上述黏著劑層例如可包含選自丙烯酸系黏著劑、橡膠系黏著劑(天然橡膠系、合成橡膠系、該等之混合系等)、矽酮系黏著劑、聚酯系黏著劑、胺基甲酸酯系黏著劑、聚醚系黏著劑、聚醯胺系黏著劑、氟系黏著劑等公知之各種黏著劑之1種或2種以上之黏著劑。於包含2種以上之黏著劑之黏著劑層中,該等黏著劑可為選自同一系統之黏著劑(例如,丙烯酸系黏著劑)之2種以上,亦可自2種以上之不同系統之黏著劑(例如,丙烯酸系黏著劑及聚酯系黏著劑)中各選擇1種或2種以上。於包含上述2種以上之黏著劑之黏著劑層中,該等黏著劑可均勻混合,亦可在厚度方向上配置(例如積層)於不同位置,亦可在平面方向上配置(例如分塗)於不同位置,亦可為將該等組合而成之配置、或該等之中間配置。 <Adhesive layer (1st adhesive layer)> In the adhesive sheet disclosed here, as the adhesive constituting the adhesive layer (first adhesive layer) disposed on at least one side of the base material, any appropriate adhesive may be used as long as the effects of the present invention can be obtained. agent. The above-mentioned adhesive layer may include, for example, an adhesive selected from the group consisting of acrylic adhesives, rubber adhesives (natural rubber systems, synthetic rubber systems, mixtures thereof, etc.), silicone adhesives, polyester adhesives, and amine-based adhesives. One or more of various known adhesives such as acid ester adhesives, polyether adhesives, polyamide adhesives, and fluorine adhesives. In an adhesive layer containing more than two types of adhesives, the adhesives may be two or more types of adhesives selected from the same system (for example, acrylic adhesives), or they may be selected from two or more different systems. Select one or two or more types of adhesives (for example, acrylic adhesives and polyester adhesives). In an adhesive layer containing more than two kinds of adhesives mentioned above, these adhesives can be mixed evenly, or they can be arranged in different positions in the thickness direction (such as stacking), or they can be arranged in the plane direction (such as separate coating). At different positions, it can also be a configuration that is a combination of these, or an intermediate configuration of these.

第1黏著劑層之厚度較佳為5 μm以上。如第1黏著劑層之厚度為5 μm以上,則容易發揮對被黏著體之表面形狀之良好追隨性。第1黏著劑層之厚度之上限例如可為200 μm以下,亦可為150 μm以下,並無特別限制。於若干態樣中,就防止由黏著劑層之凝集破壞所引起之糊劑殘留、或於該黏著劑層上實施半導體晶片之樹脂密封步驟之使用態樣中抑制半導體晶片嵌埋至黏著片材等觀點而言,第1黏著劑層之厚度為110 μm以下較為適當,較佳為60 μm以下,更佳為20 μm以下。The thickness of the first adhesive layer is preferably 5 μm or more. If the thickness of the first adhesive layer is 5 μm or more, it can easily follow the surface shape of the adherend. The upper limit of the thickness of the first adhesive layer may be, for example, 200 μm or less, or 150 μm or less, and is not particularly limited. In some aspects, it is to prevent the paste residue caused by the aggregation damage of the adhesive layer, or to suppress the embedding of the semiconductor chip in the adhesive sheet in the use aspect of performing the resin sealing step of the semiconductor chip on the adhesive layer. From other viewpoints, it is more appropriate that the thickness of the first adhesive layer is 110 μm or less, preferably 60 μm or less, and more preferably 20 μm or less.

<A層> 典型而言,上述黏著劑層(第1黏著劑層)包含構成該黏著劑層之至少表面之A層。於若干態樣中,上述黏著劑層可為包含上述A層之單層構造。於該情形時,上述A層可藉由使上述表面之相反側與基材之單側表面直接接合而形成。於其他若干態樣中,上述黏著劑層可為如下構成,即,於上述A層與上述基材之單側表面之間介置與上述A層不同之其他黏著劑層(例如,下述B層)。於該態樣中,構成上述A層之黏著劑與構成上述其他黏著劑層之黏著劑之不同之處例如可為基礎聚合物之不同(例如,構成該基礎聚合物之單體成分之組成之不同、重量平均分子量之不同、聚合物鏈之結構之不同等)、交聯劑之不同(例如,種類或使用量之不同)、黏著賦予樹脂之不同(例如,有無含有黏著賦予樹脂、黏著賦予樹脂之含量、黏著賦予樹脂之種類等之不同)、有無含有其他添加劑、其他添加劑之含量、種類等之不同等之1種或2種以上。 <Level A> Typically, the adhesive layer (first adhesive layer) includes layer A constituting at least the surface of the adhesive layer. In some aspects, the adhesive layer may be a single-layer structure including the A layer. In this case, the above-mentioned A layer can be formed by directly bonding the opposite side of the above-mentioned surface to one side surface of the base material. In some other aspects, the above-mentioned adhesive layer may be composed as follows, that is, another adhesive layer different from the above-mentioned A layer is interposed between the above-mentioned A layer and one side surface of the above-mentioned substrate (for example, the following B layer). In this aspect, the difference between the adhesive constituting the A layer and the adhesive constituting the other adhesive layers may be, for example, the difference in the base polymer (for example, the composition of the monomer components constituting the base polymer). Differences, differences in weight average molecular weight, differences in polymer chain structures, etc.), differences in cross-linking agents (e.g., differences in type or dosage), differences in adhesion-imparting resins (e.g., whether it contains adhesion-imparting resin, adhesion-imparting resin, etc.) (differences in resin content, type of adhesion-providing resin, etc.), presence or absence of other additives, differences in content, type of other additives, etc., one or more types.

於若干個較佳之態樣中,構成上述A層之黏著劑係將丙烯酸系聚合物作為基礎聚合物之丙烯酸系黏著劑。藉由丙烯酸系黏著劑構成第1黏著劑層之至少表面,藉此可較佳發揮此處所揭示之發明之效果。In some preferred aspects, the adhesive constituting the above-mentioned layer A is an acrylic adhesive using an acrylic polymer as a base polymer. By forming at least the surface of the first adhesive layer with an acrylic adhesive, the effects of the invention disclosed here can be better exerted.

(丙烯酸系聚合物) 作為丙烯酸系黏著劑之基礎聚合物之丙烯酸系聚合物較佳為包含(甲基)丙烯酸烷基酯作為主單體且可視需要進而包含與上述主單體具有共聚合性之副單體之單體成分之聚合物。此處,主單體係指構成丙烯酸系聚合物之單體成分中之主成分、即在該單體成分中以超過50重量%之形式所包含之成分。 (Acrylic polymer) The acrylic polymer as the base polymer of the acrylic adhesive preferably contains an alkyl (meth)acrylate as a main monomer and optionally further contains a sub-monomer copolymerizable with the main monomer. Body composition of polymers. Here, the main monomer refers to the main component among the monomer components constituting the acrylic polymer, that is, the component contained in the monomer component in an amount exceeding 50% by weight.

作為(甲基)丙烯酸烷基酯,例如可較佳使用下述式(A)所表示之化合物。 CH 2=C(R 1)COOR 2(A) 此處,上述式(A)中之R 1為氫原子或甲基。又,R 2為碳原子數1~20之鏈狀烷基(以下,有時將此種碳原子數之範圍表示為「C 1-20」)。就黏著特性之調節容易性等觀點而言,較佳為R 2為C 1-18之鏈狀烷基之(甲基)丙烯酸烷基酯,更佳為R 2為C 1-12之鏈狀烷基之(甲基)丙烯酸烷基酯。 As the (meth)acrylic acid alkyl ester, for example, a compound represented by the following formula (A) can be preferably used. CH 2 =C(R 1 )COOR 2 (A) Here, R 1 in the above formula (A) is a hydrogen atom or a methyl group. Moreover, R 2 is a chain alkyl group having 1 to 20 carbon atoms (hereinafter, this range of carbon atoms may be expressed as "C 1-20 "). From the viewpoint of ease of adjustment of adhesive properties, a (meth)acrylic acid alkyl ester in which R 2 is a C 1-18 chain alkyl group is preferred, and R 2 is a C 1-12 chain alkyl group. Alkyl (meth)acrylate.

作為上述(甲基)丙烯酸烷基酯之具體例,可例舉:(甲基)丙烯酸甲酯、(甲基)丙烯酸乙酯、(甲基)丙烯酸丙酯、(甲基)丙烯酸異丙酯、(甲基)丙烯酸丁酯、(甲基)丙烯酸異丁酯、(甲基)丙烯酸第二丁酯、(甲基)丙烯酸第三丁酯、(甲基)丙烯酸戊酯、(甲基)丙烯酸己酯、(甲基)丙烯酸庚酯、(甲基)丙烯酸辛酯、(甲基)丙烯酸2-乙基己酯、(甲基)丙烯酸異辛酯、(甲基)丙烯酸壬酯、(甲基)丙烯酸異壬酯、(甲基)丙烯酸癸酯、(甲基)丙烯酸異癸酯、(甲基)丙烯酸十一烷基酯、(甲基)丙烯酸十二烷基酯、(甲基)丙烯酸十三烷基酯、(甲基)丙烯酸十四烷基酯、(甲基)丙烯酸十五烷基酯、(甲基)丙烯酸十六烷基酯、(甲基)丙烯酸十七烷基酯、(甲基)丙烯酸十八烷基酯、(甲基)丙烯酸十九烷基酯、(甲基)丙烯酸二十烷基酯等(甲基)丙烯酸C 1-20烷基酯。其中,較佳使用具有C 4-20(更佳為C 6-20,進而較佳為C 8-18)之直鏈狀或支鏈狀烷基之(甲基)丙烯酸烷基酯(例如,(甲基)丙烯酸2-乙基己酯)。 Specific examples of the alkyl (meth)acrylate include (methyl)acrylate, ethyl(meth)acrylate, propyl(meth)acrylate, and isopropyl(meth)acrylate. , butyl (meth)acrylate, isobutyl (meth)acrylate, second butyl (meth)acrylate, third butyl (meth)acrylate, amyl (meth)acrylate, (meth) Hexyl acrylate, heptyl (meth)acrylate, octyl (meth)acrylate, 2-ethylhexyl (meth)acrylate, isooctyl (meth)acrylate, nonyl (meth)acrylate, ( Isononyl methacrylate, decyl (meth)acrylate, isodecyl (meth)acrylate, undecyl (meth)acrylate, dodecyl (meth)acrylate, (meth)acrylate )Tridecyl acrylate, Tetradecyl (meth)acrylate, Pentadecyl (meth)acrylate, Cetyl (meth)acrylate, Heptadecyl (meth)acrylate C 1-20 alkyl (meth)acrylate such as ester, stearyl (meth)acrylate, nonadecyl (meth)acrylate, eicosanyl (meth)acrylate. Among them, (meth)acrylic acid alkyl esters having a linear or branched alkyl group of C 4-20 (more preferably C 6-20 , further preferably C 8-18 ) (for example, 2-Ethylhexyl (meth)acrylate).

於若干態樣中,構成丙烯酸系聚合物之單體成分中之30重量%以上為上述式(A)中之R 2為碳數4以上(較佳為8以上。又,較佳為18以下,例如12以下)之直鏈狀或支鏈狀烷基之結構之(甲基)丙烯酸烷基酯。藉由使用該(甲基)丙烯酸烷基酯,可較佳抑制黏著劑層/密封樹脂間之成分移行。丙烯酸系聚合物之合成中所使用之單體成分中之上述(甲基)丙烯酸烷基酯之含量較佳為40重量%以上,於若干態樣中,亦可為50重量%以上,亦可為70重量%以上。關於單體成分中之上述(甲基)丙烯酸烷基酯之含量,就容易將測定位置A處之壓痕硬度H1調整至較佳範圍之觀點而言,單體成分中之上述(甲基)丙烯酸烷基酯之含量為99.5重量%以下較為適當,較佳為99重量%以下,亦可為98重量%以下,亦可為97重量%以下。 In some aspects, at least 30% by weight of the monomer components constituting the acrylic polymer are R 2 in the above formula (A) having a carbon number of 4 or more (preferably 8 or more. Also, preferably 18 or less) (For example, 12 or less) (meth)acrylic acid alkyl ester with a linear or branched alkyl group structure. By using this alkyl (meth)acrylate, component migration between the adhesive layer/sealing resin can be better suppressed. The content of the above-mentioned alkyl (meth)acrylate in the monomer component used in the synthesis of the acrylic polymer is preferably 40% by weight or more. In some embodiments, it may be 50% by weight or more. It is more than 70% by weight. Regarding the content of the above-mentioned (meth)acrylic acid alkyl ester in the monomer component, from the viewpoint of easily adjusting the indentation hardness H1 at the measurement position A to a preferable range, the above-mentioned (meth)acrylic acid alkyl ester in the monomer component is The content of alkyl acrylate is suitably 99.5% by weight or less, preferably 99% by weight or less, 98% by weight or less, or 97% by weight or less.

與作為主單體之(甲基)丙烯酸烷基酯具有共聚合性之副單體可有助於在丙烯酸系聚合物中導入交聯點,或提高丙烯酸系聚合物之凝集力或耐熱性。副單體亦可有助於調節壓痕硬度H1。作為副單體,例如,可將如下所示之含官能基之單體單獨使用1種或組合2種以上使用。例如,可將如下所示之含官能基之單體單獨使用1種或組合2種以上使用。The submonomer copolymerizable with the alkyl (meth)acrylate as the main monomer can help introduce cross-linking points into the acrylic polymer, or improve the cohesion or heat resistance of the acrylic polymer. The secondary monomer can also help adjust the indentation hardness H1. As the secondary monomer, for example, the functional group-containing monomers shown below can be used alone or in combination of two or more types. For example, the functional group-containing monomers shown below can be used alone or in combination of two or more types.

丙烯酸、甲基丙烯酸、丙烯酸羧基乙酯、丙烯酸羧基戊酯、伊康酸、馬來酸、富馬酸、丁烯酸等含羧基之單體; 馬來酸酐、伊康酸酐等酸酐單體; (甲基)丙烯酸羥基乙酯、(甲基)丙烯酸羥基丙酯、(甲基)丙烯酸羥基丁酯、(甲基)丙烯酸羥基己酯、(甲基)丙烯酸羥基辛酯、(甲基)丙烯酸羥基癸酯、(甲基)丙烯酸羥基月桂酯、甲基丙烯酸(4-羥基甲基環己基)甲酯等含羥基之單體; (甲基)丙烯醯胺、N,N-二甲基(甲基)丙烯醯胺、N-丁基(甲基)丙烯醯胺、N-羥甲基(甲基)丙烯醯胺、N-羥甲基丙烷(甲基)丙烯醯胺等(N-取代)醯胺系單體; N-乙烯基-2-吡咯啶酮、N-甲基乙烯基吡咯啶酮、N-乙烯基吡啶、N-乙烯基哌啶酮、N-乙烯基嘧啶、N-乙烯基哌𠯤、N-乙烯基吡𠯤、N-乙烯基吡咯、N-乙烯基咪唑、N-乙烯基㗁唑、N-乙烯基𠰌啉、N-乙烯基己內醯胺、N-(甲基)丙烯醯基𠰌啉等具有含氮原子之環之單體; (甲基)丙烯酸胺基乙酯、(甲基)丙烯酸N,N-二甲基胺基乙酯、(甲基)丙烯酸第三丁基胺基乙酯等含胺基之單體; (甲基)丙烯酸縮水甘油酯等含環氧基之丙烯酸系單體; 丙烯腈、甲基丙烯腈等含氰基之單體; 苯乙烯磺酸、烯丙基磺酸、2-(甲基)丙烯醯胺-2-甲基丙磺酸、(甲基)丙烯醯胺丙磺酸、(甲基)丙烯酸磺丙酯、(甲基)丙烯醯氧基萘磺酸等含磺酸基之單體; N-環己基馬來醯亞胺、N-異丙基馬來醯亞胺、N-月桂基馬來醯亞胺、N-苯基馬來醯亞胺等馬來醯亞胺系單體; N-甲基伊康醯亞胺、N-乙基伊康醯亞胺、N-丁基伊康醯亞胺、N-辛基伊康醯亞胺、N-2-乙基己基伊康醯亞胺、N-環己基伊康醯亞胺、N-月桂基伊康醯亞胺等伊康醯亞胺系單體; N-(甲基)丙烯醯氧基亞甲基丁二醯亞胺、N-(甲基)丙烯醯基-6-氧基六亞甲基丁二醯亞胺、N-(甲基)丙烯醯基-8-氧基八亞甲基丁二醯亞胺等丁二醯亞胺系單體; 3-(甲基)丙烯醯氧基丙基三甲氧基矽烷、3-(甲基)丙烯醯氧基丙基三乙氧基矽烷、3-(甲基)丙烯醯氧基丙基甲基二甲氧基矽烷、3-(甲基)丙烯醯氧基丙基甲基二乙氧基矽烷等含烷氧基矽烷基之單體。 Acrylic acid, methacrylic acid, carboxyethyl acrylate, carboxypentyl acrylate, itaconic acid, maleic acid, fumaric acid, crotonic acid and other carboxyl group-containing monomers; Anhydride monomers such as maleic anhydride and itaconic anhydride; Hydroxyethyl (meth)acrylate, hydroxypropyl (meth)acrylate, hydroxybutyl (meth)acrylate, hydroxyhexyl (meth)acrylate, hydroxyoctyl (meth)acrylate, (meth)acrylic acid Hydroxyl-containing monomers such as hydroxydecyl ester, hydroxylauryl (meth)acrylate, (4-hydroxymethylcyclohexyl)methyl methacrylate; (Meth)acrylamide, N,N-dimethyl(meth)acrylamide, N-butyl(meth)acrylamide, N-hydroxymethyl(meth)acrylamide, N- (N-substituted) amide monomers such as hydroxymethylpropane (meth)acrylamide; N-vinyl-2-pyrrolidone, N-methylvinylpyrrolidone, N-vinylpyridine, N-vinylpiperidone, N-vinylpyrimidine, N-vinylpiperidine, N- Vinyl pyrrole, N-vinyl pyrrole, N-vinylimidazole, N-vinyl 㗁azole, N-vinyl pyroline, N-vinyl caprolactam, N-(meth)acrylamide Phenoline and other monomers with rings containing nitrogen atoms; Amino-containing monomers such as (meth)aminoethyl acrylate, N,N-dimethylaminoethyl (meth)acrylate, and tert-butylaminoethyl (meth)acrylate; Epoxy group-containing acrylic monomers such as glycidyl (meth)acrylate; Acrylonitrile, methacrylonitrile and other cyano group-containing monomers; Styrenesulfonic acid, allylsulfonic acid, 2-(meth)acrylamide-2-methylpropanesulfonic acid, (meth)acrylamidepropanesulfonic acid, (meth)acrylic acid sulfopropyl ester, (meth)acrylamide-2-methylpropanesulfonic acid Monomers containing sulfonic acid groups such as meth)acryloxynaphthalene sulfonic acid; Maleimide monomers such as N-cyclohexylmaleimide, N-isopropylmaleimide, N-laurylmaleimide, and N-phenylmaleimide; N-Methyl itonimide, N-ethyl itonimide, N-butyl itonimide, N-octyl itonimide, N-2-ethylhexyl itonide Iconidimine-based monomers such as imine, N-cyclohexyliconidimine, N-lauryl itonidimine; N-(meth)acryloxymethylenesuccinimide, N-(meth)acryloxy-6-oxyhexamethylenesuccinimide, N-(meth)propylene Succinimide monomers such as acyl-8-oxyoctamethylene succinimide; 3-(meth)acryloxypropyltrimethoxysilane, 3-(meth)acryloxypropyltriethoxysilane, 3-(meth)acryloxypropylmethyldi Methoxysilane, 3-(meth)acryloxypropylmethyldiethoxysilane and other alkoxysilyl-containing monomers.

關於單體成分,為了提高凝集力等目的,亦可包含除如上述所例示之含官能基之單體以外之其他共聚合性單體作為副單體。作為該其他共聚合性單體之例,可例舉:乙酸乙烯酯、丙酸乙烯酯、月桂酸乙烯酯等乙烯酯系單體;苯乙烯、取代苯乙烯(α-甲基苯乙烯等)、乙烯基甲苯等芳香族乙烯基化合物;(甲基)丙烯酸環己酯、(甲基)丙烯酸環戊酯、(甲基)丙烯酸異𦯉酯等(甲基)丙烯酸環烷基酯;(甲基)丙烯酸芳基酯(例如(甲基)丙烯酸苯酯)、(甲基)丙烯酸芳氧基烷基酯(例如(甲基)丙烯酸苯氧基乙酯)、(甲基)丙烯酸芳基烷基酯(例如(甲基)丙烯酸苄酯)等含芳香族性環之(甲基)丙烯酸酯;乙烯、丙烯、異戊二烯、丁二烯、異丁烯等烯烴系單體;氯乙烯、偏二氯乙烯等含氯單體;異氰酸2-(甲基)丙烯醯氧基乙酯等含異氰酸基之單體;(甲基)丙烯酸甲氧基乙酯、(甲基)丙烯酸乙氧基乙酯等含烷氧基之單體;甲基乙烯基醚、乙基乙烯基醚等乙烯基醚系單體;聚乙二醇(甲基)丙烯酸酯、聚丙二醇(甲基)丙烯酸酯、甲氧基乙二醇(甲基)丙烯酸酯、甲氧基聚丙二醇(甲基)丙烯酸酯等二醇系單體; 此外,(甲基)丙烯酸四氫糠酯等含雜環之單體、氟(甲基)丙烯酸酯、矽酮(甲基)丙烯酸酯等。 Regarding the monomer component, other copolymerizable monomers other than the functional group-containing monomers exemplified above may be included as sub-monomers for the purpose of improving cohesion or the like. Examples of the other copolymerizable monomers include vinyl ester monomers such as vinyl acetate, vinyl propionate, and vinyl laurate; styrene, substituted styrene (α-methylstyrene, etc.) , vinyltoluene and other aromatic vinyl compounds; (meth)cycloalkyl acrylates such as (meth)cyclohexyl acrylate, (meth)cyclopentyl acrylate, (meth)isopropyl acrylate, etc.; Aryl acrylate (such as phenyl (meth)acrylate), aryloxyalkyl (meth)acrylate (such as phenoxyethyl (meth)acrylate), arylalkyl (meth)acrylate (meth)acrylates containing aromatic rings such as benzyl (meth)acrylate); olefin monomers such as ethylene, propylene, isoprene, butadiene, isobutylene; vinyl chloride, vinylidene Chlorine-containing monomers such as dichloroethylene; isocyanate-containing monomers such as 2-(meth)acryloyloxyethyl isocyanate; methoxyethyl (meth)acrylate, (meth)acrylic acid Alkoxy group-containing monomers such as ethoxyethyl ester; vinyl ether monomers such as methyl vinyl ether and ethyl vinyl ether; polyethylene glycol (meth)acrylate, polypropylene glycol (methyl) Diol monomers such as acrylate, methoxyethylene glycol (meth)acrylate, and methoxypolypropylene glycol (meth)acrylate; In addition, heterocyclic ring-containing monomers such as tetrahydrofurfuryl (meth)acrylate, fluorine (meth)acrylate, silicone (meth)acrylate, etc.

單體成分亦可包含多官能性單體作為上述其他共聚合性單體用以交聯等。於此種多官能性單體之非限定性例中可包含:己二醇二(甲基)丙烯酸酯、(聚)乙二醇二(甲基)丙烯酸酯、(聚)丙二醇二(甲基)丙烯酸酯、新戊二醇二(甲基)丙烯酸酯、季戊四醇二(甲基)丙烯酸酯、三羥甲基丙烷三(甲基)丙烯酸酯、季戊四醇三(甲基)丙烯酸酯、二季戊四醇六(甲基)丙烯酸酯、多官能環氧丙烯酸酯、多官能聚酯丙烯酸酯、多官能胺基甲酸酯丙烯酸酯等多官能性單體;等。多官能性單體可單獨使用1種,或組合2種以上使用。The monomer component may also include polyfunctional monomers as other copolymerizable monomers mentioned above for cross-linking and the like. Non-limiting examples of such multifunctional monomers may include: hexylene glycol di(meth)acrylate, (poly)ethylene glycol di(meth)acrylate, (poly)propylene glycol di(meth)acrylate ) Acrylate, neopentyl glycol di(meth)acrylate, pentaerythritol di(meth)acrylate, trimethylolpropane tri(meth)acrylate, pentaerythritol tri(meth)acrylate, dipentaerythritol hexacrylate Multifunctional monomers such as (meth)acrylates, multifunctional epoxy acrylates, multifunctional polyester acrylates, and multifunctional urethane acrylates; etc. A polyfunctional monomer can be used individually by 1 type, or in combination of 2 or more types.

於若干個較佳之態樣中,上述丙烯酸系聚合物較佳為包含來自均聚物之玻璃轉移溫度(Tg)為-5℃~150℃(較佳為50℃~150℃、更佳為80℃~120℃)之單體之構成單元a。藉由包含此種構成單元a,可實現丙烯酸系聚合物之分子移動受到限制且該利用脈衝NMR所得之S成分之T 2弛豫時間可被較佳調整之A層。又,藉由第1黏著劑層之至少表面包含上述A層,可獲得低溫黏著性優異之黏著片材。關於上述構成單元a之含量,相對於構成丙烯酸系聚合物之總構成單元,上述構成單元a之含量較佳為0.1重量%~20重量%,更佳為1重量%~10重量%,尤佳為1.5重量%~8重量%,最佳為3重量%~6重量%。 In some preferred aspects, the acrylic polymer preferably contains a homopolymer with a glass transition temperature (Tg) of -5°C to 150°C (preferably 50°C to 150°C, more preferably 80 ℃ ~ 120 ℃) structural unit of the monomer a. By including such a structural unit a, it is possible to realize an A layer in which the molecular movement of the acrylic polymer is restricted and the T 2 relaxation time of the S component obtained by pulse NMR can be better adjusted. Furthermore, by including the above-mentioned A layer on at least the surface of the first adhesive layer, an adhesive sheet excellent in low-temperature adhesiveness can be obtained. Regarding the content of the above-mentioned structural unit a, relative to the total structural units constituting the acrylic polymer, the content of the above-mentioned structural unit a is preferably 0.1% to 20% by weight, more preferably 1% to 10% by weight, and particularly preferably The content is 1.5% to 8% by weight, preferably 3% to 6% by weight.

作為均聚物之Tg為-5℃~150℃之單體,例如可例舉:丙烯酸2-羥基乙酯(Tg:-3℃)、甲基丙烯酸2-羥基乙酯(Tg:77℃)、丙烯酸(Tg:102℃)、甲基丙烯酸環己酯(Tg:83℃)、丙烯酸二環戊酯(Tg:120℃)、甲基丙烯酸二環戊酯(Tg:175℃)、丙烯酸異𦯉酯(Tg:94℃)、甲基丙烯酸異𦯉酯(Tg:150℃)、甲基丙烯酸第三丁酯(Tg:118℃)、甲基丙烯酸甲酯(Tg:105℃)、苯乙烯(Tg:80℃)、丙烯腈(Tg:97℃)、N-丙烯醯基𠰌啉(Tg:145℃)等。作為除上述以外之單體之均聚物之玻璃轉移溫度,使用「Polymer Handbook」(第3版,John Wiley & Sons, Inc., 1989年)等公知資料中所記載之值。關於在上述Polymer Handbook中記載有複數個值之單體,採用最高值。於在公知資料中未記載有均聚物之Tg之情形時,使用藉由日本專利申請公開2007-51271號公報所記載之測定方法所獲得之值。 該等單體可單獨使用1種,或組合2種以上使用。其中,由於甲基丙烯酸甲酯提高黏著劑層之透明性,故而於提高加工時之被黏著體視認性之情形時,甲基丙烯酸甲酯較佳。又,由於丙烯酸藉由分子間相互作用而強力地黏著於被黏著體,故而在需要強黏著時,丙烯酸較佳。又,由於(甲基)丙烯酸2-羥基乙酯表現出與多種交聯劑較高之反應性,故而適於形成下述T 2弛豫時間較短之黏著劑。 Examples of monomers whose Tg of the homopolymer is -5°C to 150°C include: 2-hydroxyethyl acrylate (Tg: -3°C), 2-hydroxyethyl methacrylate (Tg: 77°C) , Acrylic acid (Tg: 102℃), Cyclohexyl methacrylate (Tg: 83℃), Dicyclopentyl acrylate (Tg: 120℃), Dicyclopentyl methacrylate (Tg: 175℃), Isoacrylate ester (Tg: 94℃), isoester methacrylate (Tg: 150℃), tert-butyl methacrylate (Tg: 118℃), methyl methacrylate (Tg: 105℃), styrene (Tg: 80°C), acrylonitrile (Tg: 97°C), N-acrylamide (Tg: 145°C), etc. As the glass transition temperature of homopolymers of monomers other than the above, values described in publicly known materials such as "Polymer Handbook" (3rd edition, John Wiley & Sons, Inc., 1989) are used. For monomers with multiple values recorded in the above-mentioned Polymer Handbook, the highest value is used. When the Tg of the homopolymer is not described in publicly known documents, the value obtained by the measurement method described in Japanese Patent Application Publication No. 2007-51271 is used. These monomers can be used individually by 1 type, or in combination of 2 or more types. Among them, methyl methacrylate is preferable when improving the visibility of the adherend during processing because methyl methacrylate improves the transparency of the adhesive layer. In addition, since acrylic acid strongly adheres to the adherend through intermolecular interactions, acrylic acid is preferred when strong adhesion is required. In addition, since 2-hydroxyethyl (meth)acrylate exhibits high reactivity with various cross-linking agents, it is suitable for forming an adhesive with a short T 2 relaxation time as described below.

於若干個較佳之態樣中,上述丙烯酸系聚合物包含來自含羧基之單體之構成單元。關於來自含羧基之單體之構成單元之含量,相對於構成丙烯酸系聚合物之總構成單元,來自含羧基之單體之構成單元之含量較佳為0.1重量%以上,更佳為1重量%以上,進而較佳為2重量%以上,又,較佳為15重量%以下,更佳為10重量%以下,進而較佳為7重量%以下。In some preferred aspects, the acrylic polymer includes structural units derived from carboxyl group-containing monomers. Regarding the content of the structural units derived from the carboxyl group-containing monomer, the content of the structural units derived from the carboxyl group-containing monomer is preferably 0.1% by weight or more, more preferably 1% by weight, relative to the total structural units constituting the acrylic polymer. Above, more preferably 2 wt% or more, more preferably 15 wt% or less, more preferably 10 wt% or less, still more preferably 7 wt% or less.

於若干個較佳之態樣中,上述丙烯酸系聚合物包含來自含羥基之單體之構成單元。關於來自含羥基之單體之構成單元之含量,相對於構成丙烯酸系聚合物之總構成單元,來自含羥基之單體之構成單元之含量較佳為0.01重量%以上,更佳為0.03重量%以上,例如為0.05重量%以上,又,較佳為20重量%以下,更佳為10重量%以下,例如為7重量%以下。In some preferred aspects, the acrylic polymer includes structural units derived from hydroxyl-containing monomers. Regarding the content of the structural units derived from the hydroxyl-containing monomer, the content of the structural units derived from the hydroxyl-containing monomer is preferably 0.01% by weight or more, more preferably 0.03% by weight relative to the total structural units constituting the acrylic polymer. The above amount is, for example, 0.05% by weight or more, and preferably 20% by weight or less, more preferably 10% by weight or less, for example, 7% by weight or less.

(SP值) 於若干態樣中,構成A層之黏著劑之基礎聚合物(較佳為丙烯酸系聚合物)之SP值例如為10以上30以下較為適當,較佳為15以上25以下,尤佳為18以上20以下。若為此種範圍,則可較佳防止黏著劑層/密封樹脂間之成分移行。再者,本說明書中表示SP值之數值之單元均為「(cal/cm 3) 1/2」。 (SP value) In some aspects, the SP value of the base polymer (preferably an acrylic polymer) constituting the adhesive of the A layer is, for example, 10 to 30, which is more appropriate, and preferably 15 to 25, especially Preferably 18 or above and 20 below. If it is within this range, migration of components between the adhesive layer/sealing resin can be better prevented. Furthermore, the numerical units used to express SP values in this specification are all "(cal/cm 3 ) 1/2 ".

此處,SP值係指藉由Fedors所提出之方法根據化合物之基本結構所算出之值。具體而言,根據25℃下之各原子或原子團之蒸發能量Δe(cal)、與相同溫度下之各原子或原子團之莫耳容積Δv(cm 3),依據以下之式算出SP值。 SP值=(ΣΔe/ΣΔv) 1/2(參考文獻:山本秀樹著,「SP值 基礎、應用及計算方法」,第4刷,Johokiko股份有限公司出版,2006年4月3日發行,第66~67頁)。 Here, the SP value refers to the value calculated based on the basic structure of the compound by the method proposed by Fedors. Specifically, the SP value is calculated according to the following formula based on the evaporation energy Δe (cal) of each atom or atomic group at 25°C and the molar volume Δv (cm 3 ) of each atom or atomic group at the same temperature. SP value = (ΣΔe/ΣΔv) 1/2 (Reference: Hideki Yamamoto, "SP Value Basics, Applications and Calculation Methods", No. 4, published by Johokiko Co., Ltd., issued on April 3, 2006, No. 66 ~page 67).

於聚合物為共聚物之情形時,其SP值藉由如下方式算出,即,算出構成該共聚物之各構成單元之各個單獨共聚物之SP值,將該等SP值之每一者乘以各構成單元之莫耳分率所得者進行合計而算出共聚物之SP值。於上述情形時,各構成單元之分析方法(聚合物之組成分析)係自該黏著片材僅適當收集黏著劑層,回收使之浸漬於二甲基甲醯胺(DMF)、丙酮、甲醇、四氫呋喃(THF)等有機溶劑中所獲得之溶劑可溶部分,根據凝膠過濾滲透層析法(GPC)、核磁共振光譜法(NMR)、紅外光譜法(IR)、質量分析之分析方法進行求取。When the polymer is a copolymer, its SP value is calculated by calculating the SP value of each individual copolymer of each structural unit constituting the copolymer, and multiplying each of these SP values by The molar fractions of each structural unit were totaled to calculate the SP value of the copolymer. In the above case, the analysis method of each structural unit (polymer composition analysis) is to collect only the adhesive layer appropriately from the adhesive sheet, recover it, and immerse it in dimethylformamide (DMF), acetone, methanol, The solvent-soluble fraction obtained from organic solvents such as tetrahydrofuran (THF) is determined based on the analytical methods of gel filtration permeation chromatography (GPC), nuclear magnetic resonance spectroscopy (NMR), infrared spectroscopy (IR), and mass analysis. Pick.

(交聯劑) 就容易實現上述較佳之壓痕硬度H1之觀點而言,上述A層之基礎聚合物較佳為在構成該A層之黏著劑中交聯。例如,藉由使用包含基礎聚合物及適當交聯劑之黏著劑組合物,可獲得包含該基礎聚合物藉由上述交聯劑交聯之黏著劑之A層。 (cross-linking agent) From the viewpoint of easily realizing the above-mentioned preferable indentation hardness H1, it is preferable that the base polymer of the above-mentioned A layer is cross-linked in the adhesive constituting the A layer. For example, by using an adhesive composition including a base polymer and an appropriate cross-linking agent, an A layer including an adhesive in which the base polymer is cross-linked by the cross-linking agent can be obtained.

交聯劑之種類並無特別限制,例如可自異氰酸酯系交聯劑、環氧系交聯劑、三聚氰胺系交聯劑、過氧化物系交聯劑、以及脲系交聯劑、金屬烷氧化物系交聯劑、金屬螯合物系交聯劑、金屬鹽系交聯劑、碳二醯亞胺系交聯劑、㗁唑啉系交聯劑、氮丙啶系交聯劑、胺系交聯劑等中進行適當選擇而使用。交聯劑可單獨使用1種,或組合2種以上使用。其中,作為較佳之交聯劑,可例舉:環氧系交聯劑及異氰酸酯系交聯劑。The type of cross-linking agent is not particularly limited. For example, it can be selected from isocyanate-based cross-linking agents, epoxy-based cross-linking agents, melamine-based cross-linking agents, peroxide-based cross-linking agents, urea-based cross-linking agents, and metal alkoxides. Physical cross-linking agent, metal chelate cross-linking agent, metal salt cross-linking agent, carbodiimide cross-linking agent, oxazoline cross-linking agent, aziridine cross-linking agent, amine cross-linking agent Cross-linking agents and the like are appropriately selected and used. A cross-linking agent can be used individually by 1 type, or in combination of 2 or more types. Among them, preferred cross-linking agents include epoxy cross-linking agents and isocyanate cross-linking agents.

作為環氧系交聯劑,例如可例舉:N,N,N',N'-四縮水甘油基間苯二甲胺、二縮水甘油基苯胺、1,3-雙(N,N-縮水甘油胺甲基)環己烷(三菱瓦斯化學公司製造,商品名「Tetrad C」)、1,6-己二醇二縮水甘油醚(共榮社化學公司製造,商品名「Epolight 1600」)、新戊二醇二縮水甘油醚(共榮社化學公司製造,商品名「Epolight 1500 NP」)、乙二醇二縮水甘油醚(共榮社化學公司製造,商品名「Epolight 40E」)、丙二醇二縮水甘油醚(共榮社化學公司製造,商品名「Epolight 70P」)、聚乙二醇二縮水甘油醚(日本油脂公司製造,商品名「EPIOL E-400」)、聚丙二醇二縮水甘油醚(日本油脂公司製造,商品名「EPIOL P-200」)、山梨醇聚縮水甘油醚(長瀨化成公司製造,商品名「Denacol EX-611」)、甘油聚縮水甘油醚(長瀨化成公司製造,商品名「Denacol EX-314」)、季戊四醇聚縮水甘油醚、聚甘油聚縮水甘油醚(長瀨化成公司製造,商品名「Denacol EX-512」)、山梨醇酐聚縮水甘油醚、三羥甲基丙烷聚縮水甘油醚、己二酸二縮水甘油酯、鄰苯二甲酸二縮水甘油酯、三縮水甘油基-三(2-羥基乙基)異氰尿酸酯、間苯二酚二縮水甘油醚、雙酚-S-二縮水甘油醚、分子內具有2個以上之環氧基之環氧系樹脂等。環氧系交聯劑之使用量可根據目標特性設定為任意適當量。於若干態樣中,相對於基礎聚合物100重量份之環氧系交聯劑之使用量例如可為0.01重量份以上50重量份以下,較佳為0.6重量份以上15重量份以下,更佳為2重量份以上13重量份以下,進而較佳為3重量份以上10重量份以下。Examples of the epoxy cross-linking agent include: N,N,N',N'-tetraglycidyl m-xylylenediamine, diglycidyl aniline, 1,3-bis(N,N- Glycerylamine methyl)cyclohexane (manufactured by Mitsubishi Gas Chemical Co., Ltd., trade name "Tetrad C"), 1,6-hexanediol diglycidyl ether (manufactured by Kyeisha Chemical Co., Ltd., trade name "Epolight 1600"), Neopentyl glycol diglycidyl ether (manufactured by Kyoeisha Chemical Co., Ltd., trade name "Epolight 1500 NP"), ethylene glycol diglycidyl ether (manufactured by Kyoeisha Chemical Co., Ltd., trade name "Epolight 40E"), propylene glycol diglycidyl ether Glycidyl ether (manufactured by Kyeisha Chemical Co., Ltd., trade name "Epolight 70P"), polyethylene glycol diglycidyl ether (manufactured by Nippon Oils and Fats Co., Ltd., trade name "EPIOL E-400"), polypropylene glycol diglycidyl ether ( Manufactured by Nippon Oils and Fats Corporation, trade name "EPIOL P-200"), sorbitol polyglycidyl ether (manufactured by Nagase Chemical Co., Ltd., trade name "Denacol EX-611"), glycerol polyglycidyl ether (manufactured by Nagase Chemical Co., Ltd., Trade name "Denacol EX-314"), pentaerythritol polyglycidyl ether, polyglycerol polyglycidyl ether (manufactured by Nagase Chemical Co., Ltd., trade name "Denacol EX-512"), sorbitan polyglycidyl ether, trimethylol Propane polyglycidyl ether, diglycidyl adipate, diglycidyl phthalate, triglycidyl-tris(2-hydroxyethyl)isocyanurate, resorcinol diglycidyl Ether, bisphenol-S-diglycidyl ether, epoxy resins with two or more epoxy groups in the molecule, etc. The usage amount of the epoxy cross-linking agent can be set to any appropriate amount according to the target properties. In some aspects, the usage amount of the epoxy cross-linking agent relative to 100 parts by weight of the base polymer can be, for example, 0.01 to 50 parts by weight, preferably 0.6 to 15 parts by weight, and more preferably It is 2 parts by weight or more and 13 parts by weight or less, and more preferably 3 parts by weight or more and 10 parts by weight or less.

作為異氰酸酯系交聯劑之具體例,可例舉:伸丁基二異氰酸酯、六亞甲基二異氰酸酯等低級脂肪族聚異氰酸酯類;伸環戊基二異氰酸酯、伸環己基二異氰酸酯、異佛爾酮二異氰酸酯等脂環族異氰酸酯類;2,4-甲苯二異氰酸酯、4,4'-二苯基甲烷二異氰酸酯、苯二甲基二異氰酸酯等芳香族異氰酸酯類;三羥甲基丙烷/甲苯二異氰酸酯三聚物加成物(東曹公司製造,商品名「Coronate L」)、三羥甲基丙烷/六亞甲基二異氰酸酯三聚物加成物(東曹公司製造,商品名「Coronate HL」)、六亞甲基二異氰酸酯之異氰尿酸酯體(東曹公司製造,商品名「Coronate HX」)等異氰酸酯加成物;等。異氰酸酯系交聯劑之使用量可根據所需之黏著力設定為任意適當量。於若干態樣中,代表性而言,相對於基礎聚合物100重量份之異氰酸酯系交聯劑之使用量為0.1重量份以上20重量份以下,較佳為1重量份以上10重量份以下。Specific examples of isocyanate cross-linking agents include lower aliphatic polyisocyanates such as butyl diisocyanate and hexamethylene diisocyanate; cyclopentyl diisocyanate, cyclohexyl diisocyanate, isophor Alicyclic isocyanates such as ketone diisocyanate; aromatic isocyanates such as 2,4-toluene diisocyanate, 4,4'-diphenylmethane diisocyanate, xylylene diisocyanate; trimethylolpropane/toluene diisocyanate Isocyanate trimer adduct (manufactured by Tosoh Corporation, trade name "Coronate L"), trimethylolpropane/hexamethylene diisocyanate trimer adduct (manufactured by Tosoh Corporation, trade name "Coronate HL") "), isocyanate adducts such as the isocyanurate body of hexamethylene diisocyanate (manufactured by Tosoh Corporation, trade name "Coronate HX"); etc. The usage amount of the isocyanate cross-linking agent can be set to any appropriate amount according to the required adhesive force. In some aspects, representatively, the usage amount of the isocyanate cross-linking agent is 0.1 to 20 parts by weight relative to 100 parts by weight of the base polymer, preferably 1 to 10 parts by weight.

於若干態樣中,作為A層中所使用之交聯劑,可較佳採用環氧系交聯劑。根據具有基礎聚合物藉由環氧系交聯劑交聯之交聯結構之A層,可較佳實現此處所揭示之較佳之壓痕硬度H1。又,可獲得半導體晶片與密封樹脂之階差可較佳減少之黏著片材。又,可形成凝集力較高之黏著劑層,可更有效地防止被黏著體之位置偏移。In some aspects, as the cross-linking agent used in layer A, an epoxy cross-linking agent can be preferably used. According to the A layer having a cross-linked structure in which the base polymer is cross-linked by an epoxy cross-linking agent, the better indentation hardness H1 disclosed here can be better achieved. Furthermore, it is possible to obtain an adhesive sheet in which the step difference between the semiconductor chip and the sealing resin can be relatively reduced. In addition, it can form an adhesive layer with higher cohesive force, which can more effectively prevent the position of the adherend from shifting.

於若干態樣中,作為上述交聯劑,可較佳使用包含氮(N)原子之交聯劑。關於包含N原子之交聯劑,就藉由該N原子之觸媒作用而促進交聯反應(例如,與基礎聚合物中之羧基之反應),容易提高黏著劑之凝膠分率之方面而言,包含N原子之交聯劑較為有利。作為包含N原子之交聯劑之具體例,除如上所述之異氰酸酯交聯劑以外,亦可例舉包含N原子之環氧系交聯劑(例如,具有縮水甘油胺基之環氧系交聯劑,如N,N,N',N'-四縮水甘油基間苯二甲胺或1,3-雙(N,N-縮水甘油胺甲基)環己烷等)。於使用包含N原子之交聯劑之若干態樣中,較佳為以下述氮氣產生量成為0.06重量%以上1.0重量%以下(更佳為0.06重量%以上0.9重量%以下)之方式設定該交聯劑之使用量。藉由設為該使用量,容易獲得較佳地兼顧糊劑殘留防止及對表面形狀之追隨性之黏著片材。In some aspects, as the above-mentioned cross-linking agent, a cross-linking agent containing nitrogen (N) atoms may be preferably used. The cross-linking agent containing N atoms promotes the cross-linking reaction (for example, the reaction with the carboxyl group in the base polymer) through the catalytic effect of the N atom, and it is easy to increase the gel fraction of the adhesive. In other words, cross-linking agents containing N atoms are advantageous. Specific examples of the crosslinking agent containing N atoms include, in addition to the isocyanate crosslinking agents described above, epoxy crosslinking agents containing N atoms (for example, epoxy crosslinking agents having a glycidylamine group). Coupling agent, such as N,N,N',N'-tetraglycidyl m-xylylenediamine or 1,3-bis(N,N-glycidylaminemethyl)cyclohexane, etc.). In some aspects of using a cross-linking agent containing N atoms, it is preferable to set the cross-linking agent so that the amount of nitrogen generated is 0.06% by weight or more and 1.0% by weight or less (more preferably 0.06% by weight or more and 0.9% by weight or less). The dosage of combined agent. By setting this usage amount, it is easy to obtain an adhesive sheet that has both the prevention of paste residue and the ability to follow the surface shape.

於若干態樣中,交聯劑(較佳為藉由與羧基之反應而形成交聯結構之交聯劑。例如環氧系交聯劑、異氰酸酯系交聯劑等)相對於基礎聚合物(例如丙烯酸系聚合物)所具有之羧基量之使用量較佳為0.08莫耳當量以上2莫耳當量以下,更佳為0.1莫耳當量以上1莫耳當量以下。根據該使用量,可準確地實現此處所揭示之較佳之壓痕硬度H1。又,藉由使上述使用量之交聯劑與基礎聚合物中之羧基發生交聯反應,可獲得黏著劑層中之殘存羧基較少之黏著片材。In some aspects, the cross-linking agent (preferably a cross-linking agent that forms a cross-linked structure by reacting with carboxyl groups. For example, an epoxy cross-linking agent, an isocyanate cross-linking agent, etc.) relative to the base polymer ( For example, the usage amount of the carboxyl group contained in the acrylic polymer) is preferably 0.08 molar equivalent or more and 2 molar equivalent or less, more preferably 0.1 molar equivalent or more and 1 molar equivalent or less. Based on this usage amount, the preferred indentation hardness H1 disclosed herein can be accurately achieved. Furthermore, by cross-linking the cross-linking agent in the above-mentioned amount with the carboxyl groups in the base polymer, an adhesive sheet with less residual carboxyl groups in the adhesive layer can be obtained.

(其他添加劑) 構成A層之黏著劑中可視需要含有除上述以外之適當添加劑作為任意成分。作為此種添加劑,例如可例舉:黏著賦予劑、塑化劑(例如,偏苯三甲酸酯系塑化劑、均苯四甲酸酯系塑化劑等)、顏料、染料、填充劑、抗老化劑、導電材料、抗靜電劑、紫外線吸收劑、光穩定劑、剝離調整劑、軟化劑、界面活性劑、阻燃劑、抗氧化劑等。 (Other additives) The adhesive constituting the A layer may contain appropriate additives other than the above as optional components if necessary. Examples of such additives include tackifiers, plasticizers (for example, trimellitate-based plasticizers, pyromellitate-based plasticizers, etc.), pigments, dyes, fillers, Anti-aging agents, conductive materials, antistatic agents, ultraviolet absorbers, light stabilizers, peeling adjusters, softeners, surfactants, flame retardants, antioxidants, etc.

作為上述黏著賦予劑,可使用任意適當之黏著賦予劑。作為黏著賦予劑,例如可使用黏著賦予樹脂。作為該黏著賦予樹脂之具體例,可例舉:松香系黏著賦予樹脂(例如,未改性松香、改性松香、松香酚醛系樹脂、松香酯系樹脂等)、萜烯系黏著賦予樹脂(例如,萜烯系樹脂、萜烯酚系樹脂、苯乙烯改性萜烯系樹脂、芳香族改性萜烯系樹脂、氫化萜烯系樹脂)、烴系黏著賦予樹脂(例如,脂肪族系烴樹脂、脂肪族系環狀烴樹脂、芳香族系烴樹脂(例如,苯乙烯系樹脂、二甲苯系樹脂等)、脂肪族/芳香族系石油樹脂、脂肪族/脂環族系石油樹脂、氫化烴樹脂、苯并呋喃系樹脂、苯并呋喃-茚系樹脂等)、酚系黏著賦予樹脂(例如,烷基酚系樹脂、二甲苯-甲醛系樹脂、可溶酚醛樹脂、酚醛清漆等)、酮系黏著賦予樹脂、聚醯胺系黏著賦予樹脂、環氧系黏著賦予樹脂、彈性體系黏著賦予樹脂等。其中,較佳為松香系黏著賦予樹脂、萜烯系黏著賦予樹脂或烴系黏著賦予樹脂(苯乙烯系樹脂等)。黏著賦予劑可單獨使用1種,或組合2種以上使用。As the above-mentioned tackifier, any appropriate tackifier can be used. As the tackifier, for example, a tackifier resin can be used. Specific examples of the tackifier-imparting resin include rosin-based tackifier-imparting resins (eg, unmodified rosin, modified rosin, rosin phenolic resin, rosin ester-based resin, etc.), terpene-based tackifier-imparting resins (eg, unmodified rosin, modified rosin, rosin phenolic resin, rosin ester resin, etc.). , terpene-based resin, terpene-phenol-based resin, styrene-modified terpene-based resin, aromatic modified terpene-based resin, hydrogenated terpene-based resin), hydrocarbon-based tackifier resin (for example, aliphatic hydrocarbon resin , aliphatic cyclic hydrocarbon resin, aromatic hydrocarbon resin (for example, styrenic resin, xylene resin, etc.), aliphatic/aromatic petroleum resin, aliphatic/alicyclic petroleum resin, hydrogenated hydrocarbon resins, benzofuran-based resins, benzofuran-indene-based resins, etc.), phenolic adhesive-imparting resins (e.g., alkylphenol-based resins, xylene-formaldehyde-based resins, soluble phenolic resins, novolaks, etc.), ketones Adhesion-imparting resins, polyamide-based adhesion-imparting resins, epoxy-based adhesion-imparting resins, elastic system adhesion-imparting resins, etc. Among these, preferred are rosin-based tackifier resins, terpene-based tackifier resins, or hydrocarbon-based tackifier resins (styrene-based resins, etc.). The adhesive imparting agent can be used individually by 1 type, or in combination of 2 or more types.

於若干態樣中,作為上述黏著賦予樹脂,可使用軟化點或玻璃轉移溫度(Tg)較高之樹脂。若使用軟化點或玻璃轉移溫度(Tg)較高之樹脂,則即便於高溫環境下(例如,半導體晶片密封時之加工等中之高溫環境下),亦可形成可表現較高黏著性之黏著劑層。黏著賦予劑之軟化點較佳為100℃~180℃,更佳為110℃~180℃,進而較佳為120℃~180℃。黏著賦予劑之玻璃轉移溫度(Tg)較佳為100℃~180℃,更佳為110℃~180℃,進而較佳為120℃~180℃。In some aspects, as the above-mentioned adhesion-imparting resin, a resin with a higher softening point or glass transition temperature (Tg) may be used. If a resin with a high softening point or glass transition temperature (Tg) is used, it is possible to form an adhesive that exhibits high adhesion even in a high-temperature environment (for example, in a high-temperature environment during processing of semiconductor wafer sealing). agent layer. The softening point of the tackifier is preferably 100°C to 180°C, more preferably 110°C to 180°C, further preferably 120°C to 180°C. The glass transition temperature (Tg) of the tackifier is preferably 100°C to 180°C, more preferably 110°C to 180°C, further preferably 120°C to 180°C.

於若干態樣中,作為上述黏著賦予樹脂,可使用低極性之黏著賦予樹脂。關於使用低極性之黏著賦予樹脂,就形成與密封材料之親和性較低之黏著劑層之觀點而言,使用低極性之黏著賦予樹脂較為有利。作為低極性之黏著賦予樹脂,例如可例舉:脂肪族系烴樹脂、脂肪族系環狀烴樹脂、芳香族系烴樹脂(例如,苯乙烯系樹脂、二甲苯系樹脂等)、脂肪族/芳香族系石油樹脂(有時亦被稱為C5/C9系石油樹脂)、脂肪族/脂環族系石油樹脂、相當於氫化烴樹脂之烴系黏著賦予樹脂。其中,較佳為脂肪族/芳香族系石油樹脂。此種黏著賦予樹脂為低極性,且與丙烯酸系聚合物之相容性優異,於較廣之溫度範圍內不會相分離,可形成穩定性優異之黏著劑層。In some aspects, as the above-mentioned adhesion-imparting resin, a low-polarity adhesion-imparting resin may be used. Regarding the use of a low-polarity tackifier resin, it is advantageous to use a low-polarity tackifier resin from the viewpoint of forming an adhesive layer with low affinity for the sealing material. Examples of low-polarity tackifying resins include aliphatic hydrocarbon resins, aliphatic cyclic hydrocarbon resins, aromatic hydrocarbon resins (for example, styrene-based resins, xylene-based resins, etc.), aliphatic/ Aromatic petroleum resins (sometimes also called C5/C9 petroleum resins), aliphatic/alicyclic petroleum resins, and hydrocarbon-based tackifier resins equivalent to hydrogenated hydrocarbon resins. Among them, aliphatic/aromatic petroleum resins are preferred. This kind of adhesive-imparting resin has low polarity and excellent compatibility with acrylic polymers. It does not phase separate in a wide temperature range and can form an adhesive layer with excellent stability.

上述黏著賦予樹脂之酸值較佳為40以下,更佳為20以下,進而較佳為10以下。若為此種範圍,則可形成與密封材料之親和性較低之黏著劑層。上述黏著賦予樹脂之羥值較佳為60以下,更佳為40以下,進而較佳為20以下。若為此種範圍,則可形成與密封材料之親和性較低、適於抑制黏著劑層/密封樹脂間之成分移行之黏著劑層。The acid value of the above-mentioned tackifying resin is preferably 40 or less, more preferably 20 or less, still more preferably 10 or less. If it is within this range, an adhesive layer having low affinity with the sealing material can be formed. The hydroxyl value of the above-mentioned tackifying resin is preferably 60 or less, more preferably 40 or less, and still more preferably 20 or less. If it is within this range, it is possible to form an adhesive layer that has low affinity with the sealing material and is suitable for suppressing component migration between the adhesive layer/sealing resin.

關於黏著賦予劑之使用量,相對於基礎聚合物100重量份,黏著賦予劑之使用量例如可為5重量份以上100重量份以下,較佳為8重量份以上50重量份以下。於此處所揭示之黏著片材之若干態樣中,就自被黏著體之輕剝離性或對糊劑殘留之抑制等觀點而言,將黏著賦予劑相對於構成A層之黏著劑之基礎聚合物100重量份之調配量設為未達3重量份、未達1重量份或未達0.5重量份較為適當,較佳為在構成A層之黏著劑中不調配黏著賦予劑(特別是黏著賦予樹脂)。Regarding the usage amount of the tackifier, relative to 100 parts by weight of the base polymer, the usage amount of the tackifier may be, for example, 5 to 100 parts by weight, preferably 8 to 50 parts by weight. In some aspects of the adhesive sheet disclosed here, the adhesive imparting agent is polymerized to the base of the adhesive constituting the A layer from the viewpoint of easy peelability from the adherend or suppression of paste residue. It is more appropriate to set the compounding amount of 100 parts by weight to less than 3 parts by weight, less than 1 part by weight, or less than 0.5 parts by weight. It is preferable that no adhesive imparting agent (especially adhesive imparting agent) is included in the adhesive constituting the A layer. resin).

(T 2弛豫時間) 於此處所揭示之黏著片材之若干態樣中,A層之利用脈衝NMR所得之S成分之T 2弛豫時間(T 2s)較佳為45 μsec以下。根據構成第1黏著劑層之至少表面之A層之T 2弛豫時間(T 2s)為45 μsec以下的黏著片材,例如於在第1於黏著劑層上進行半導體晶片之樹脂密封之使用態樣中,抑制黏著劑層與密封樹脂之間之成分移行,從而可較佳抑制半導體晶片與密封樹脂之階差。 (T 2 Relaxation Time) In some aspects of the adhesive sheet disclosed here, the T 2 relaxation time (T 2s ) of the S component of the A layer obtained by pulse NMR is preferably 45 μsec or less. An adhesive sheet whose T 2 relaxation time (T 2s ) of layer A constituting at least the surface of the first adhesive layer is 45 μsec or less is used, for example, for resin sealing of semiconductor wafers on the first adhesive layer. In this aspect, the component migration between the adhesive layer and the sealing resin is suppressed, thereby better suppressing the step difference between the semiconductor chip and the sealing resin.

上述弛豫時間意指於脈衝NMR測定中以適於激發成為測定對象之原子之能量進行照射時所激發之原子(群)回復至基底狀態所需之時間。如何使原子(群)變為激發狀態可藉由能量照射之量或時間進行控制。又,為了使所激發之原子(群)回復至基底狀態,已知有各種能量弛豫機制,可根據該弛豫機制決定弛豫時間(例如,「面向化學家之最新NMR概論」、Kagaku-Dojin Publishing(1997))。本發明者等人發現,於下述條件下激發丙烯酸系黏著劑(實質上,黏著劑中所含之丙烯酸系聚合物)之 1H原子,測量其後之弛豫行為,進而對該測量值進行解析,結果發現,其中作為獲知與構成黏著劑層之黏著劑中所含之基礎聚合物(代表性而言,丙烯酸系聚合物)之交聯程度相關之分子移動之資訊,T 2弛豫時間之S成分(T 2s)較為有用,藉由特定出該T 2弛豫時間之S成分(T 2s),可獲得上述效果。T 2s較短表示為與基礎聚合物之交聯程度相關之分子移動受到限制之狀態,即,表示為進行交聯且作為聚合物整體之移動自由度亦降低之狀態。於此種狀態之黏著劑中,有基礎聚合物間之間隙較小,黏著劑層成分對密封樹脂之移行、或密封樹脂中所含之低分子量成分對黏著劑層之移行受到抑制之傾向。結果,於在黏著片材上對半導體晶片進行樹脂密封後剝離黏著片材時,可防止半導體晶片與密封樹脂之階差之產生。 The above-mentioned relaxation time means the time required for atoms (groups) excited by irradiation with an energy suitable for exciting atoms to be measured in pulse NMR measurement to return to the ground state. How to change atoms (groups) into an excited state can be controlled by the amount or time of energy irradiation. In addition, in order to return the excited atoms (groups) to the ground state, various energy relaxation mechanisms are known, and the relaxation time can be determined based on the relaxation mechanism (for example, "Latest Introduction to NMR for Chemists", Kagaku- Dojin Publishing (1997)). The present inventors discovered that they excited 1 H atoms of an acrylic adhesive (essentially, an acrylic polymer contained in the adhesive) under the following conditions, measured the subsequent relaxation behavior, and then measured the measured values. Analysis was conducted, and it was found that T 2 relaxation was used as information for obtaining the molecular movement related to the degree of cross-linking of the base polymer (representatively, an acrylic polymer) contained in the adhesive constituting the adhesive layer. The S component of time (T 2s ) is useful, and by specifying the S component (T 2s ) of the T 2 relaxation time, the above effects can be obtained. A short T 2s indicates a state in which molecular movement is restricted in relation to the degree of cross-linking of the base polymer, that is, a state in which cross-linking proceeds and the freedom of movement of the polymer as a whole is also reduced. In the adhesive in this state, the gap between the base polymers is small, and the migration of the adhesive layer components to the sealing resin, or the migration of the low molecular weight components contained in the sealing resin to the adhesive layer, tends to be inhibited. As a result, when the semiconductor chip is resin-sealed on the adhesive sheet and then the adhesive sheet is peeled off, it is possible to prevent the occurrence of a step difference between the semiconductor chip and the sealing resin.

關於A層之利用脈衝NMR所得之S成分之T 2弛豫時間(T 2s),就更好地抑制自密封樹脂之成分移行之觀點而言,A層之利用脈衝NMR所得之S成分之T 2弛豫時間(T 2s)較佳為40 μsec以下,更佳為35 μsec以下(例如30 μsec以下)。A層之T 2s之下限例如可為5 μsec以上,並無特別限制。就容易在黏著劑層表面中表現適度黏性之觀點而言,於若干態樣中,A層之T 2s可為10 μsec以上,亦可為15 μsec以上,亦可為20 μsec以上。關於A層之T 2s不過短,就提高A層與鄰接於其之層(可為基材、被黏著體、下述B層等)之密接性之觀點而言,較佳為A層之T 2s不過短。 Regarding the T 2 relaxation time (T 2s ) of the S component of the A layer obtained by pulse NMR, from the viewpoint of better suppressing the component migration of the self-sealing resin, the T 2 relaxation time (T 2s ) of the S component of the A layer obtained by pulse NMR 2. The relaxation time (T 2s ) is preferably 40 μsec or less, more preferably 35 μsec or less (for example, 30 μsec or less). The lower limit of T 2s of layer A can be, for example, 5 μsec or more, and is not particularly limited. From the viewpoint of easily expressing moderate viscosity on the surface of the adhesive layer, in some aspects, T 2s of layer A may be 10 μsec or more, 15 μsec or more, or 20 μsec or more. The T 2s of the A layer is not too short. From the perspective of improving the adhesion between the A layer and the layer adjacent thereto (which can be the base material, the adherend, the below-mentioned B layer, etc.), the T 2s of the A layer is preferably 2s is not too short.

A層之T 2s可藉由如下方式求出,即,獲得將構成該A層之黏著劑約100 mg作為測定樣品並藉由Solid Echo法所測得之T 2弛豫曲線,將該T 2弛豫曲線與下述式(1)擬合而求出A層之T 2s。下述B層之利用脈衝NMR所得之S成分之T 2弛豫時間(T 2s)亦可以相同之方式進行測定。 The T 2s of the A layer can be determined by obtaining a T 2 relaxation curve measured by the Solid Echo method using approximately 100 mg of the adhesive constituting the A layer as a measurement sample, and dividing the T 2 The relaxation curve is fitted to the following equation (1) to determine T 2s of the A layer. The T 2 relaxation time (T 2s ) of the S component of the B layer described below obtained by pulse NMR can also be measured in the same manner.

M(t)=α・exp(-(1/Wa)(t/T 2s) Wa)+β・exp(-(1/Wa)(t/T 2L) Wa)   ・・・(1) M(t):自由感應衰減 α:弛豫時間較短之成分(S成分)之質子比率(%) T 2s:S成分之T 2弛豫時間(msec) β:弛豫時間較長之成分(L成分)之質子比率(%) T 2L:L成分之T 2弛豫時間(msec) t:觀測時間(msec) Wa:形狀係數(=1) M(t)=α·exp(-(1/Wa)(t/T 2s ) Wa )+β·exp(-(1/Wa)(t/T 2L ) Wa ) ・・・(1) M(t ): Free induction attenuation α: Proton ratio (%) of the component with a short relaxation time (S component) T 2s : T 2 relaxation time of the S component (msec) β: A component with a long relaxation time (L component) ) proton ratio (%) T 2L : T 2 relaxation time of L component (msec) t: Observation time (msec) Wa: Shape coefficient (=1)

上述測定中之測定條件如下所示。 ・90°脈衝寬度:2.1 μsec ・重複時間:1 sec ・累計次數 :32次 ・測定溫度 :30℃ The measurement conditions in the above measurement are as follows. ・90° pulse width: 2.1 μsec ・Repetition time: 1 sec ・Cumulative number of times: 32 times ・Measurement temperature: 30℃

(凝膠分率) 構成A層之黏著劑之凝膠分率較佳為75%以上,更佳為85%以上,進而較佳為90%以上。若為此種範圍,則可藉由交聯使基礎聚合物之分子移動受到較佳限制,可抑制黏著劑層/密封樹脂間之成分移行。就上述抑制成分移行之觀點而言,構成A層之凝膠分率越高越有利。又,考慮到與其他特性(例如,黏著劑層表面中之適度黏性或黏著性、對被黏著體之表面形狀之追隨性等)之平衡等,於若干態樣中,構成A層之黏著劑之凝膠分率例如可為99.5%以下,亦可為99%以下。凝膠分率係將自A層收集之黏著劑於乙酸乙酯中浸漬7天後進行乾燥,藉由(浸漬後之黏著劑之乾燥重量/浸漬前之黏著劑之重量)×100而求出。 (gel fraction) The gel fraction of the adhesive constituting layer A is preferably 75% or more, more preferably 85% or more, and further preferably 90% or more. If it is within this range, the molecular movement of the base polymer can be better restricted through cross-linking, and the migration of components between the adhesive layer/sealing resin can be suppressed. From the viewpoint of suppressing the migration of components, it is advantageous to have a higher gel fraction constituting layer A. In addition, taking into consideration the balance with other characteristics (for example, moderate viscosity or adhesiveness on the surface of the adhesive layer, ability to follow the surface shape of the adherend, etc.), the adhesion of the A layer is constituted in some aspects. The gel fraction of the agent may be, for example, 99.5% or less, or 99% or less. The gel fraction is calculated by dipping the adhesive collected from layer A in ethyl acetate for 7 days and then drying it by (dry weight of the adhesive after immersion/weight of the adhesive before immersion) × 100 .

(氮氣產生量) 於若干態樣之黏著片材中,關於對構成A層之黏著劑進行加熱處理時之氮氣產生量,將用於該加熱處理之黏著劑之重量設為100重量%,氮氣產生量較佳為0.06重量%~1.0重量%,更佳為0.06重量%~0.9重量%。若上述氮氣產生量為0.06重量%以上,則有該黏著劑充分發揮凝集力,藉由抑制黏著劑層/密封樹脂間之成分移行而不易在半導體晶片與密封樹脂之界面產生階差之傾向。關於上述氮氣產生量為1.0重量%以下,就抑制配置於A層上之被黏著體之位置偏移之觀點而言,上述氮氣產生量為1.0重量%以下較為有利。 上述氮氣產生量可藉由如下方式求出,即,對於收集2 mg之該黏著劑放入至陶瓷板並藉由微天平所計量之樣品,藉由TN(微量總氮分析)裝置對在熱分解爐800℃/氧化爐900℃之條件下進行加熱所產生之氮氣之量進行分析而求出上述氮氣產生量。測定時之各條件可如下所示。 ・載氣:O 2(300 mL/min)、Ar(300 mL/min) ・標準試樣:吡啶/甲苯溶液 ・檢測器:減壓化學發光檢測器 ・範圍:高濃度 (Nitrogen gas generation amount) In some aspects of the adhesive sheet, regarding the nitrogen gas generation amount when the adhesive constituting the A layer is heat-treated, the weight of the adhesive used for the heat treatment is set to 100% by weight, and the nitrogen gas The production amount is preferably 0.06 to 1.0% by weight, more preferably 0.06 to 0.9% by weight. If the above-mentioned amount of nitrogen generated is 0.06% by weight or more, the adhesive will fully exert its cohesion force and suppress component migration between the adhesive layer/sealing resin, thereby making it less likely that a step will occur at the interface between the semiconductor chip and the sealing resin. From the viewpoint of suppressing the positional shift of the adherend arranged on the A layer, it is advantageous that the nitrogen generation amount is 1.0 wt% or less. The above-mentioned amount of nitrogen generated can be determined by collecting 2 mg of the adhesive on a ceramic plate and measuring it with a microbalance, and then using a TN (Trace Total Nitrogen Analysis) device to measure the temperature of the sample. The amount of nitrogen generated was determined by analyzing the amount of nitrogen generated by heating under the conditions of decomposition furnace 800°C/oxidation furnace 900°C. The conditions for measurement are as follows.・Carrier gas: O 2 (300 mL/min), Ar (300 mL/min) ・Standard sample: pyridine/toluene solution ・Detector: reduced pressure chemiluminescence detector ・Range: high concentration

<B層> 於此處所揭示之黏著片材之若干態樣中,上述第1黏著劑層包含:構成該黏著劑層之至少表面之A層、及配置於該A層與上述基材之間且與該基材鄰接之B層。即,第1黏著劑層之外表面(被黏著體側之表面)藉由A層形成,該第1黏著劑層之內表面(基材側之表面)包含B層。根據具有該構造之第1黏著劑層,例如可根據構成A層、B層之各者之黏著劑之選擇、各層之厚度之選擇等,而容易地對測定位置A、B中之特性(壓痕硬度、拉絲性、S成分之T 2弛豫時間等)或該等之比進行調節。 <Layer B> In some aspects of the adhesive sheet disclosed here, the above-mentioned first adhesive layer includes: A layer constituting at least the surface of the adhesive layer, and disposed between the A layer and the above-mentioned base material And the B layer adjacent to the substrate. That is, the outer surface of the first adhesive layer (the surface on the adherend side) is formed of the A layer, and the inner surface (the surface on the base material side) of the first adhesive layer includes the B layer. According to the first adhesive layer having this structure, for example, the characteristics (pressure) at positions A and B can be easily measured based on the selection of the adhesive constituting the layers A and B, the selection of the thickness of each layer, etc. Mark hardness, drawability, T2 relaxation time of S component, etc.) or the ratio of these can be adjusted.

作為構成B層之黏著劑,可使用任意適當之黏著劑。上述B層例如可包含選自丙烯酸系黏著劑、橡膠系黏著劑、矽酮系黏著劑、聚酯系黏著劑、胺基甲酸酯系黏著劑、聚醚系黏著劑、聚醯胺系黏著劑、氟系黏著劑等公知之各種黏著劑之1種或2種以上之黏著劑。As the adhesive constituting the B layer, any appropriate adhesive can be used. The above-mentioned B layer may include, for example, an acrylic adhesive, a rubber adhesive, a silicone adhesive, a polyester adhesive, a urethane adhesive, a polyether adhesive, and a polyamide adhesive. One or more of various well-known adhesives such as adhesives and fluorine-based adhesives.

於若干個較佳之態樣中,構成上述B層之黏著劑係將丙烯酸系聚合物作為基礎聚合物之丙烯酸系黏著劑。於A層包含丙烯酸系黏著劑之態樣中,就提高第1黏著劑層中所含之層之層間密接性之觀點而言,尤佳為採用丙烯酸系黏著劑作為構成B層之黏著劑。In some preferred aspects, the adhesive constituting the above-mentioned B layer is an acrylic adhesive using an acrylic polymer as a base polymer. In the case where the A layer contains an acrylic adhesive, from the viewpoint of improving the interlayer adhesion of the layers included in the first adhesive layer, it is particularly preferable to use an acrylic adhesive as the adhesive constituting the B layer.

於構成B層之黏著劑為丙烯酸系黏著劑之態樣中,作為該丙烯酸系黏著劑之基礎聚合物之丙烯酸系聚合物可自與上述作為A層之基礎聚合物之丙烯酸系聚合物相同者中進行適當選擇。作為A層之基礎聚合物之丙烯酸系聚合物與作為B層之基礎聚合物之丙烯酸系聚合物可相同,亦可不同。於若干態樣中,就A層與B層之密接性之觀點而言,可將A層及B層之基礎聚合物設為同一丙烯酸系聚合物。於該態樣中,可根據有無使用用於形成各層之除基礎聚合物以外之材料(交聯劑、黏著賦予劑等)、用於形成各層之除基礎聚合物以外之材料(交聯劑、黏著賦予劑等)之種類、量等之選擇,對測定位置A、B處之特性或該等之比進行調整。In the case where the adhesive constituting the B layer is an acrylic adhesive, the acrylic polymer as the base polymer of the acrylic adhesive can be the same as the acrylic polymer as the base polymer of the A layer. Make appropriate selections. The acrylic polymer used as the base polymer of layer A and the acrylic polymer used as the base polymer of layer B may be the same or different. In some aspects, from the viewpoint of the adhesion between layer A and layer B, the base polymer of layer A and layer B can be the same acrylic polymer. In this aspect, materials other than the base polymer used to form each layer (crosslinking agent, adhesion-imparting agent, etc.) may be used depending on whether or not materials other than the base polymer used to form each layer (crosslinking agent, adhesive agent, etc.) are used. The type, amount, etc. of the adhesion-imparting agent, etc.) are selected to adjust the characteristics of the measurement positions A and B or the ratio between them.

B層之基礎聚合物較佳為在構成該B層之黏著劑中交聯。例如,藉由使用包含基礎聚合物及適當交聯劑之黏著劑組合物,可獲得包含該基礎聚合物藉由上述交聯劑交聯之黏著劑之B層。B層中所使用之交聯劑之種類例如可自上述作為A層中可使用之交聯劑所例示者中進行適當選擇,並無特別限制。A層中所使用之交聯劑與B層中所使用之交聯劑可為相同種類之交聯劑(例如,相同或不同之異氰酸酯系交聯劑),亦可為不同種類之交聯劑(例如,一種為環氧系交聯劑,另一種為異氰酸酯系交聯劑)。The base polymer of the B layer is preferably cross-linked in the adhesive constituting the B layer. For example, by using an adhesive composition including a base polymer and an appropriate cross-linking agent, a layer B including an adhesive in which the base polymer is cross-linked by the above-mentioned cross-linking agent can be obtained. The type of cross-linking agent used in layer B can be appropriately selected from those exemplified above as cross-linking agents that can be used in layer A, and is not particularly limited. The cross-linking agent used in layer A and the cross-linking agent used in layer B may be the same type of cross-linking agent (for example, the same or different isocyanate-based cross-linking agents), or they may be different types of cross-linking agents. (For example, one is an epoxy-based cross-linking agent and the other is an isocyanate-based cross-linking agent).

於若干個較佳之態樣中,A層使用環氧系交聯劑,B層使用異氰酸酯系交聯劑。一般而言,與環氧系交聯劑相比,異氰酸酯系交聯劑有可形成更柔軟之交聯結構之傾向,因此根據上述態樣,可較佳實現壓痕硬度H2小於壓痕硬度H1之第1黏著劑層。In some preferred aspects, layer A uses an epoxy cross-linking agent, and layer B uses an isocyanate cross-linking agent. Generally speaking, compared with epoxy cross-linking agents, isocyanate-based cross-linking agents tend to form a softer cross-linked structure. Therefore, according to the above aspect, the indentation hardness H2 can be better achieved to be smaller than the indentation hardness H1. The first adhesive layer.

於使用異氰酸酯系交聯劑作為B層之交聯劑之情形時,異氰酸酯系交聯劑相對於B層之基礎聚合物(例如丙烯酸系聚合物)100重量份之使用量可以可獲得所需特性之方式進行適當調節,並無特別限定。於若干態樣中,異氰酸酯系交聯劑相對於B層之基礎聚合物100重量份之使用量例如為0.1重量份以上20重量份以下,較佳為1重量份以上10重量份以下,更佳為1重量份以上7重量份以下,亦可為1重量份以上5重量份以下,亦可為2重量份以上5重量份以下。When an isocyanate cross-linking agent is used as the cross-linking agent of the B layer, the usage amount of the isocyanate cross-linking agent relative to 100 parts by weight of the base polymer of the B layer (for example, an acrylic polymer) can obtain the desired properties. There are no special restrictions on how to make appropriate adjustments. In some aspects, the usage amount of the isocyanate cross-linking agent relative to 100 parts by weight of the base polymer of the B layer is, for example, 0.1 to 20 parts by weight, preferably 1 to 10 parts by weight, and more preferably It may be 1 to 7 parts by weight, it may be 1 to 5 parts by weight, or it may be 2 to 5 parts by weight.

為了更加有效地進行交聯反應,亦可使用交聯觸媒。作為交聯觸媒之例,可例舉:鈦酸四正丁酯、鈦酸四異丙酯、三乙醯丙酮鐵、氧化丁基錫、二月桂酸二辛基錫等金屬系交聯觸媒等。交聯觸媒之使用量並無特別限制。於若干態樣中,考慮到交聯反應速度之速度與黏著劑組合物之適用期之長度的平衡,可將交聯觸媒相對於基礎聚合物100重量份之使用量設為例如0.0001重量份以上1重量份以下(較佳為0.001重量份以上0.5重量份以下)。上述交聯觸媒可用於A層,亦可用於A層及B層該兩者。In order to carry out the cross-linking reaction more effectively, a cross-linking catalyst can also be used. Examples of cross-linking catalysts include metal-based cross-linking catalysts such as tetra-n-butyl titanate, tetraisopropyl titanate, iron triacetyl acetonate, butyl tin oxide, and dioctyl tin dilaurate. . The amount of cross-linking catalyst used is not particularly limited. In some aspects, taking into account the balance between the speed of the cross-linking reaction and the length of the pot life of the adhesive composition, the usage amount of the cross-linking catalyst relative to 100 parts by weight of the base polymer can be set to, for example, 0.0001 parts by weight. 1 part by weight or less (preferably 0.001 part by weight or more and 0.5 part by weight or less). The above-mentioned cross-linking catalyst can be used for the A layer, or for both the A layer and the B layer.

於此處所揭示之黏著片材之若干態樣中,關於構成第1黏著劑層之B層之利用脈衝NMR所得之S成分之T 2弛豫時間(T 2s),就提高對配置於該黏著劑層之A層上之被黏著體之表面形狀之追隨性之觀點而言,構成第1黏著劑層之B層之利用脈衝NMR所得之S成分之T 2弛豫時間(T 2s)較佳為比上述A層之T 2s長。A層之T 2s與B層之T 2s之差例如可為5 μsec以上,為10 μsec以上較為有利,更佳為15 μsec以上,更佳為20 μsec以上,亦可為25 μsec以上,亦可為30 μsec以上。又,就防止由B層之T 2s過長所引起之黏著劑層之凝集破壞之觀點而言,A層之T 2s與B層之T 2s之差例如為70 μsec以下較為適當,較佳為60 μsec以下,更佳為50 μsec以下,亦可為40 μsec以下,亦可為35 μsec以下。 In some aspects of the adhesive sheet disclosed here, the T 2 relaxation time (T 2s ) of the S component of the B layer constituting the first adhesive layer obtained by pulse NMR improves the response to the adhesive sheet disposed thereon. From the viewpoint of following the surface shape of the adherend on the A layer of the adhesive layer, the T 2 relaxation time (T 2s ) of the S component obtained by pulse NMR of the B layer constituting the first adhesive layer is better It is longer than T 2s of layer A mentioned above. The difference between T 2s of layer A and T 2s of layer B can be, for example, 5 μsec or more, preferably 10 μsec or more, more preferably 15 μsec or more, more preferably 20 μsec or more, or 25 μsec or more, or is more than 30 μsec. Furthermore, from the viewpoint of preventing aggregation damage of the adhesive layer caused by excessively long T 2s of the B layer, it is appropriate that the difference between the T 2s of the A layer and the T 2s of the B layer is, for example, 70 μsec or less, and preferably 60 μsec. μsec or less, more preferably 50 μsec or less, 40 μsec or less, or 35 μsec or less.

於若干態樣中,B層之T 2s大於A層之T 2s且為30 μsec以上(例如35 μsec以上、40 μsec以上或45 μsec以上)較為適當,就較佳發揮提高對被黏著體之表面形狀之追隨性之效果之觀點而言,B層之T 2s較佳為比45 μsec長,亦可為47 μsec以上,亦可為50 μsec以上。又,就防止B層之凝集破壞之觀點而言,該B層之T 2s為80 μsec以下較為適當,較佳為70 μsec以下,亦可為65 μsec以下,亦可為60 μsec以下,亦可為57 μsec以下。 In some aspects, it is more appropriate for the T 2s of the B layer to be greater than the T 2s of the A layer and to be above 30 μsec (for example, above 35 μsec, above 40 μsec, or above 45 μsec), so as to better enhance the effect on the surface of the adherend. From the viewpoint of the effect of shape followability, T 2s of the B layer is preferably longer than 45 μsec, may be 47 μsec or more, or may be 50 μsec or more. Furthermore, from the viewpoint of preventing aggregation damage of the B layer, it is more appropriate for the T 2s of the B layer to be 80 μsec or less, preferably 70 μsec or less, or 65 μsec or less, or 60 μsec or less, or is 57 μsec or less.

於具備包含A層及B層之構成之黏著劑層之黏著片材之若干態樣中,上述B層之厚度例如可為3 μm以上,為4 μm以上較為適當,就提高賦予對表面形狀之追隨性之效果之觀點而言,較佳為5 μm以上,亦可為7 μm以上,亦可為10 μm以上,亦可為15 μm以上。B層之厚度之上限例如可為300 μm以下、250 μm以下、150 μm以下或130 μm以下,並無特別限制。就於在上述黏著劑層上對半導體晶片進行樹脂密封之使用態樣中,抑制半導體晶片嵌埋至黏著片材之觀點而言,B層之厚度為100 μm以下較為適當,較佳為90 μm以下,亦可為70 μm以下,亦可為50 μm以下,亦可為30 μm以下,亦可為20 μm以下。In some aspects of an adhesive sheet having an adhesive layer composed of an A layer and a B layer, the thickness of the B layer may be, for example, 3 μm or more, and more preferably 4 μm or more, so as to improve the ability to impart a surface shape. From the viewpoint of the effect of followability, it is preferably 5 μm or more, 7 μm or more, 10 μm or more, or 15 μm or more. The upper limit of the thickness of the B layer may be, for example, 300 μm or less, 250 μm or less, 150 μm or less, or 130 μm or less, and is not particularly limited. From the viewpoint of suppressing the semiconductor chip from being embedded in the adhesive sheet in a usage state where the semiconductor chip is resin-sealed on the adhesive layer, the thickness of the B layer is preferably 100 μm or less, and preferably 90 μm. It may be 70 μm or less, 50 μm or less, 30 μm or less, or 20 μm or less.

於具備包含A層及B層之構成之黏著劑層之黏著片材中,上述A層之厚度例如可為1 μm以上20 μm以下。就藉由B層之幫助而較佳發揮提高對表面形狀之追隨性之效果之觀點而言,於若干態樣中,上述A層之厚度為15 μm以下較為適當,較佳為10 μm以下,亦可為8 μm以下,亦可為6 μm以下。又,就藉由A層之幫助而較佳發揮抑制黏著劑層/密封樹脂間之成分移行之效果之觀點而言,於若干態樣中,上述A層之厚度為2 μm以上較為有利,較佳為3 μm以上,亦可為4 μm以上,亦可為5 μm以上。In an adhesive sheet having an adhesive layer composed of an A layer and a B layer, the thickness of the A layer may be, for example, 1 μm or more and 20 μm or less. From the perspective of better exerting the effect of improving the ability to follow the surface shape with the help of the B layer, in some aspects, the thickness of the above-mentioned A layer is more appropriately 15 μm or less, and preferably 10 μm or less. It may be 8 μm or less, or it may be 6 μm or less. Furthermore, from the viewpoint of better exerting the effect of inhibiting the migration of components between the adhesive layer/sealing resin with the help of the A layer, in some aspects, it is more advantageous for the thickness of the above-mentioned A layer to be 2 μm or more, which is better than It is preferably 3 μm or more, 4 μm or more, or 5 μm or more.

於具備包含A層及B層之構成之黏著劑層之黏著片材中,上述B層之厚度L2[μm]相對於上述A層之厚度L1[μm]之比(L2/L1)例如可為0.5~100.0左右,並無特別限定。於若干態樣中,就容易有效發揮A層及B層之各者之功能之觀點而言,上述比(L2/L1)為0.5以上較為適當,較佳為0.7以上,亦可為0.8以上,亦可為0.9以上,亦可為1.0以上。又,就相同之觀點而言,上述比(L2/L1)為50.0以下較為適當,較佳為30.0以下,亦可為20.0以下,亦可為15.0以下,亦可為10.0以下,亦可為5.0以下,亦可為3.0以下或2.0以下。In an adhesive sheet having an adhesive layer composed of an A layer and a B layer, the ratio (L2/L1) of the thickness L2 [μm] of the above-mentioned layer B to the thickness L1 [μm] of the above-mentioned layer A (L2/L1) can be, for example It is about 0.5 to 100.0 and is not particularly limited. In some aspects, from the viewpoint of easily and effectively exerting the functions of the A layer and the B layer, the above ratio (L2/L1) is more appropriately 0.5 or more, preferably 0.7 or more, and may also be 0.8 or more. It may be 0.9 or more, or it may be 1.0 or more. Moreover, from the same viewpoint, the above-mentioned ratio (L2/L1) is more appropriately 50.0 or less, preferably 30.0 or less, 20.0 or less, 15.0 or less, 10.0 or less, or 5.0. below, it can also be below 3.0 or below 2.0.

<基材> 此處所揭示之黏著片材之基材例如可為樹脂片材、不織布、紙、金屬箔、織布、橡膠片材、發泡片材、該等之積層體(特別是包含樹脂片材之積層體)等。作為構成樹脂片材之樹脂,例如可例舉:聚對苯二甲酸乙二酯(PET)、聚萘二甲酸乙二酯(PEN)、聚對苯二甲酸丁二酯(PBT)、聚乙烯(PE)、聚丙烯(PP)、乙烯-丙烯共聚物、乙烯-乙酸乙烯酯共聚物(EVA)、聚醯胺(尼龍)、全芳香族聚醯胺(aramid)、聚醯亞胺(PI)、聚氯乙烯(PVC)、聚苯硫醚(PPS)、氟系樹脂、聚醚醚酮(PEEK)等。作為不織布,可例舉:包含馬尼拉麻之不織布等利用具有耐熱性之天然纖維所得之不織布;聚丙烯樹脂不織布、聚乙烯樹脂不織布、酯系樹脂不織布等合成樹脂不織布等。作為金屬箔,可為例舉:銅箔、不鏽鋼箔、鋁箔等。作為紙,可例舉:日本紙、牛皮紙等。 <Substrate> The base material of the adhesive sheet disclosed here may be, for example, a resin sheet, nonwoven fabric, paper, metal foil, woven fabric, rubber sheet, foam sheet, or a laminate of these (especially a laminate including a resin sheet). body) etc. Examples of the resin constituting the resin sheet include polyethylene terephthalate (PET), polyethylene naphthalate (PEN), polybutylene terephthalate (PBT), and polyethylene. (PE), polypropylene (PP), ethylene-propylene copolymer, ethylene-vinyl acetate copolymer (EVA), polyamide (nylon), fully aromatic polyamide (aramid), polyimide (PI) ), polyvinyl chloride (PVC), polyphenylene sulfide (PPS), fluorine resin, polyether ether ketone (PEEK), etc. Examples of nonwoven fabrics include nonwoven fabrics made from heat-resistant natural fibers such as abaca-based nonwoven fabrics; synthetic resin nonwoven fabrics such as polypropylene resin nonwoven fabrics, polyethylene resin nonwoven fabrics, and ester resin nonwoven fabrics. Examples of the metal foil include copper foil, stainless steel foil, aluminum foil, and the like. Examples of paper include Japanese paper, kraft paper, and the like.

於若干態樣中,較佳使用包含玻璃轉移溫度(Tg)為25℃以上(較佳為40℃以上、更佳為50℃以上)之樹脂的樹脂片材作為基材。若使用此種樹脂片材,則即便藉由密封步驟時之加熱,亦可維持基材之形狀,防止半導體晶片嵌埋至黏著片材。作為構成此種樹脂片材之樹脂,較佳為具有芳香族環之聚合物,作為具體例,可例舉:聚對苯二甲酸乙二酯(PET)、聚醯亞胺、聚萘二甲酸乙二酯等,但並不限定於該等。In some aspects, it is preferable to use a resin sheet containing a resin with a glass transition temperature (Tg) of 25°C or higher (preferably 40°C or higher, more preferably 50°C or higher) as the base material. If such a resin sheet is used, the shape of the base material can be maintained even by heating during the sealing step, preventing the semiconductor chip from being embedded in the adhesive sheet. The resin constituting the resin sheet is preferably a polymer having an aromatic ring. Specific examples include polyethylene terephthalate (PET), polyimide, and polynaphthalenedicarboxylic acid. Ethylene glycol, etc., but are not limited to these.

上述基材之厚度可根據所需之強度或柔軟性、以及使用目的等而設定為任意適當之厚度。基材之厚度較佳為1000 μm以下,更佳為25 μm以上1000 μm以下,進而較佳為40 μm以上500 μm以下,尤佳為60 μm以上300 μm以下,最佳為80 μm以上250 μm以下。於1個實施方式中,可使用厚度為25 μm以上之基材。此種厚度之基材即便經由密封步驟時之加壓,亦容易維持基材之形狀,適於防止半導體晶片嵌埋至黏著片材。The thickness of the above-mentioned base material can be set to any appropriate thickness according to required strength or flexibility, purpose of use, etc. The thickness of the substrate is preferably 1000 μm or less, more preferably 25 μm or more and 1000 μm or less, further preferably 40 μm or more and 500 μm or less, especially 60 μm or more and 300 μm or less, and most preferably 80 μm or more and 250 μm or more. the following. In one embodiment, a substrate with a thickness of 25 μm or more can be used. A substrate with such a thickness can easily maintain the shape of the substrate even after being pressurized during the sealing step, and is suitable for preventing the semiconductor chip from being embedded in the adhesive sheet.

於1個實施方式中,關於基材之厚度,相對於黏著片材之總厚度,為20%以上90%以下(較佳為20%以上89%以下,更佳為20%以上88%以下)。於此種範圍中,可較佳防止半導體晶片嵌埋至黏著片材。In one embodiment, the thickness of the base material is 20% or more and 90% or less (preferably 20% or more and 89% or less, more preferably 20% or more and 88% or less) relative to the total thickness of the adhesive sheet. . In this range, the semiconductor chip can be preferably prevented from being embedded in the adhesive sheet.

上述基材亦可實施表面處理。作為表面處理,例如可例舉:電暈處理、鉻酸處理、臭氧暴露、火焰暴露、高壓電擊暴露、離子化輻射處理、利用底塗劑所進行之塗佈處理等。The above-mentioned base material may also be subjected to surface treatment. Examples of surface treatment include corona treatment, chromic acid treatment, ozone exposure, flame exposure, high-voltage electric shock exposure, ionizing radiation treatment, and coating treatment using a primer.

作為上述底塗劑,可使用有機塗佈材料。作為上述有機塗佈材料,例如可例舉:CMC出版之「塑膠硬塗材料II」(2004年出版)中所記載之材料。可較佳使用胺基甲酸酯系聚合物,可更佳使用聚丙烯酸胺基甲酸酯、聚酯胺基甲酸酯或該等之前驅物。其原因在於,對基材之塗敷、塗佈較為簡便,且在工業上可選擇多種製品,可便宜地獲取。該胺基甲酸酯系聚合物例如為包含異氰酸酯單體與含醇性羥基之單體(例如,含羥基之丙烯酸化合物或含羥基之酯化合物)之反應混合物之聚合物。有機塗佈材料亦可包含聚胺等擴鏈劑、抗老化劑、氧化穩定劑等作為任意添加劑。有機塗佈層之厚度並無特別限定,但例如可為0.1 μm~10 μm左右較為適合,較佳為0.1 μm~5 μm左右,更佳為0.5 μm~5 μm左右。As the above-mentioned primer, an organic coating material can be used. Examples of the above-mentioned organic coating materials include materials described in "Plastic Hard Coat Materials II" published by CMC (2004 publication). Urethane polymers can be preferably used, and polyacrylic urethane, polyester urethane or precursors thereof can be more preferably used. The reason for this is that it is relatively easy to coat and coat the base material, and a variety of products are industrially available and can be obtained cheaply. The urethane polymer is, for example, a polymer including a reaction mixture of an isocyanate monomer and an alcoholic hydroxyl-containing monomer (for example, a hydroxyl-containing acrylic compound or a hydroxyl-containing ester compound). The organic coating material may also contain chain extenders such as polyamine, anti-aging agents, oxidation stabilizers, etc. as optional additives. The thickness of the organic coating layer is not particularly limited, but for example, it is suitably about 0.1 μm to 10 μm, preferably about 0.1 μm to 5 μm, more preferably about 0.5 μm to 5 μm.

<第2黏著劑層> 關於若干態樣之黏著片材,具備上述基材、配置於上述基材之單側之上述黏著劑層、及配置於上述基材之與上述黏著劑層相反一側之第2黏著劑層。該構成之黏著片材(附基材之雙面黏著片材)由於可於例如利用上述第2黏著劑層而固定於適當之載具(例如,SUS板、玻璃板等)上之形態中在上述第1黏著劑層上進行樹脂密封步驟,故而可用性較佳。上述第2黏著劑層可為包含任意適當之黏著劑之黏著劑層。 <Second adhesive layer> Some aspects of the adhesive sheet include the base material, the adhesive layer disposed on one side of the base material, and a second adhesive layer disposed on the opposite side of the base material to the adhesive layer. The adhesive sheet (double-sided adhesive sheet with base material) having this structure can be fixed on an appropriate carrier (for example, SUS plate, glass plate, etc.) using the second adhesive layer, for example. The resin sealing step is performed on the above-mentioned first adhesive layer, so the usability is better. The above-mentioned second adhesive layer may be an adhesive layer containing any appropriate adhesive.

於若干態樣之黏著片材中,上述第2黏著劑層之至少表面包含含有熱膨脹性微小球之黏著劑。該態樣之黏著片材視需要進行適當時間之加熱而使上述熱膨脹性微小球膨脹,藉此可容易解除上述第2黏著劑層與被黏著體(例如上述載具)之接合,故而較佳。In some aspects of the adhesive sheet, at least the surface of the second adhesive layer includes an adhesive containing thermally expandable microspheres. The adhesive sheet in this form is preferably heated for an appropriate period of time to expand the thermally expandable microballoons, thereby easily releasing the bond between the second adhesive layer and the adherend (such as the carrier). .

含有熱膨脹性微小球之黏著劑可為硬化型黏著劑(例如,活性能量線硬化型黏著劑),亦可為感壓型黏著劑。作為感壓型黏著劑,例如可例舉:丙烯酸系黏著劑、橡膠系黏著劑等。第2黏著劑層中所含之黏著劑之詳細內容例如可參照日本專利申請公開2018-009050號公報之記載。該公報之整體記載係以參考之方式援用於本說明書中。The adhesive containing thermally expandable microspheres can be a hardening adhesive (for example, an active energy ray hardening adhesive) or a pressure-sensitive adhesive. Examples of the pressure-sensitive adhesive include acrylic adhesives, rubber adhesives, and the like. For details on the adhesive contained in the second adhesive layer, refer to the description of Japanese Patent Application Publication No. 2018-009050, for example. The entire description of this publication is incorporated into this specification by reference.

作為上述熱膨脹性微小球,只要為可藉由加熱而膨脹或發泡之微球,則可使用任意適當之熱膨脹性微小球。作為上述熱膨脹性微小球,例如可使用使具有彈性之殼內內包有容易藉由加熱而膨脹之物質所得之微球。此種熱膨脹性微小球可藉由任意適當之方法、例如凝聚法、界面聚合法等製造。As the heat-expandable microspheres, any appropriate heat-expandable microspheres can be used as long as they can be expanded or foamed by heating. As the thermally expandable microspheres, for example, microspheres obtained by enclosing a substance that easily expands by heating can be used in an elastic shell. Such thermally expandable microspheres can be produced by any appropriate method, such as agglomeration method, interfacial polymerization method, etc.

作為容易藉由加熱而膨脹之物質,例如可例舉:丙烷、丙烯、丁烯、正丁烷、異丁烷、異戊烷、新戊烷、正戊烷、正己烷、異己烷、庚烷、辛烷、石油醚、甲烷之鹵化物、四烷基矽烷等低沸點液體;藉由熱分解而氣化之偶氮二甲醯胺;等。Examples of substances that easily expand by heating include propane, propylene, butylene, n-butane, isobutane, isopentane, neopentane, n-pentane, n-hexane, isohexane, and heptane. , octane, petroleum ether, methane halides, tetraalkyl silanes and other low-boiling point liquids; azodimethylamide vaporized by thermal decomposition; etc.

作為構成上述殼之物質,例如可例舉包含如下成分之聚合物:丙烯腈、甲基丙烯腈、α-氯丙烯腈、α-乙氧基丙烯腈、反丁烯二腈等腈單體;丙烯酸、甲基丙烯酸、伊康酸、馬來酸、富馬酸、檸康酸等羧酸單體;偏二氯乙烯;乙酸乙烯酯;(甲基)丙烯酸甲酯、(甲基)丙烯酸乙酯、(甲基)丙烯酸正丁酯、(甲基)丙烯酸異丁酯、(甲基)丙烯酸第三丁酯、(甲基)丙烯酸異𦯉酯、(甲基)丙烯酸環己酯、(甲基)丙烯酸苄酯、β-丙烯酸羧基乙酯等(甲基)丙烯酸酯;苯乙烯、α-甲基苯乙烯、氯苯乙烯等苯乙烯單體;丙烯醯胺、取代丙烯醯胺、甲基丙烯醯胺、取代甲基丙烯醯胺等醯胺單體;等。包含該等單體之聚合物可為均聚物,亦可為共聚物。作為該共聚物,例如可例舉:偏二氯乙烯-甲基丙烯酸甲酯-丙烯腈共聚物、甲基丙烯酸甲酯-丙烯腈-甲基丙烯腈共聚物、甲基丙烯酸甲酯-丙烯腈共聚物、丙烯腈-甲基丙烯腈-伊康酸共聚物等。Examples of substances constituting the shell include polymers containing the following components: nitrile monomers such as acrylonitrile, methacrylonitrile, α-chloroacrylonitrile, α-ethoxyacrylonitrile, and fumaronitrile; Carboxylic acid monomers such as acrylic acid, methacrylic acid, itaconic acid, maleic acid, fumaric acid, citraconic acid; vinylidene chloride; vinyl acetate; methyl (meth)acrylate, ethyl (meth)acrylate Ester, n-butyl (meth)acrylate, isobutyl (meth)acrylate, tert-butyl (meth)acrylate, isopropyl (meth)acrylate, cyclohexyl (meth)acrylate, (meth)acrylate (meth)acrylates such as benzyl acrylate and β-carboxyethyl acrylate; styrene monomers such as styrene, α-methylstyrene and chlorostyrene; acrylamide, substituted acrylamide, methyl Acrylamide, substituted methacrylamide and other amide monomers; etc. The polymer containing these monomers may be a homopolymer or a copolymer. Examples of the copolymer include vinylidene chloride-methyl methacrylate-acrylonitrile copolymer, methyl methacrylate-acrylonitrile-methacrylonitrile copolymer, and methyl methacrylate-acrylonitrile. Copolymer, acrylonitrile-methacrylonitrile-itaconic acid copolymer, etc.

作為上述熱膨脹性微小球,可使用無機系發泡劑或有機系發泡劑。作為無機系發泡劑,例如可例舉:碳酸銨、碳酸氫銨、碳酸氫鈉、亞硝酸銨、硼氫化鈉、各種疊氮基類等。又,作為有機系發泡劑,例如可例舉:三氯單氟甲烷、二氯單氟甲烷等氟氯化烷烴系化合物;偶氮二異丁腈、偶氮二甲醯胺、偶氮二甲酸鋇等偶氮系化合物;對甲苯磺醯肼、二苯碸-3,3'-二磺醯肼、4,4'-氧基雙(苯磺醯肼)、烯丙基雙(磺醯肼)等肼系化合物;對甲苯磺醯胺基脲、4,4'-氧基雙(苯磺醯胺基脲)等胺脲系化合物;5-𠰌啉基-1,2,3,4-噻三唑等三唑系化合物;N,N'-二亞硝基五亞甲基四胺、N,N'-二甲基-N,N'-二亞硝基對苯二甲醯胺;等N-亞硝基系化合物等。As the thermally expandable microspheres, an inorganic foaming agent or an organic foaming agent can be used. Examples of inorganic foaming agents include ammonium carbonate, ammonium bicarbonate, sodium bicarbonate, ammonium nitrite, sodium borohydride, various azides, and the like. Examples of the organic foaming agent include: fluorochloroalkane compounds such as trichloromonofluoromethane and dichloromonofluoromethane; azobisisobutyronitrile, azodimethylamide, azobis Azo compounds such as barium formate; p-toluene sulfonyl hydrazine, diphenyl-3,3'-disulfonyl hydrazine, 4,4'-oxybis(benzenesulfonyl hydrazine), allyl bis(sulfonyl hydrazine) Hydrazine compounds such as hydrazine); amidourea compounds such as p-toluenesulfonamide amidourea and 4,4'-oxybis(benzenesulfonamide amidourea); 5-𠰌linyl-1,2,3,4 -Thiatriazole and other triazole compounds; N,N'-dinitrosopentamethylenetetramine, N,N'-dimethyl-N,N'-dinitrosoterephthalamide ; and other N-nitroso compounds, etc.

上述熱膨脹性微小球可使用市售品。作為市售品之熱膨脹性微小球之具體例,可例舉:松本油脂製藥公司製造之商品名「Matsumoto Microsphere」(等級:F-30、F-30D、F-36D、F-36LV、F-50、F-50D、F-65、F-65D、FN-100SS、FN-100SSD、FN-180SS、FN-180SSD、F-190D、F-260D、F-2800D)、Japan Fillite公司製造之商品名「Expancel」(等級:053-40、031-40、920-40、909-80、930-120)、吳羽化學工業公司製造之「Daifoam」(等級:H750、H850、H1100、S2320D、S2640D、M330、M430、M520)、積水化學工業公司製造之「AdvanCell」(等級:EML101、EMH204、EHM301、EHM302、EHM303、EM304、EHM401、EM403、EM501)等。Commercially available products can be used as the thermally expandable microspheres. Specific examples of commercially available heat-expandable microspheres include: "Matsumoto Microsphere" (trade name: F-30, F-30D, F-36D, F-36LV, F- 50. F-50D, F-65, F-65D, FN-100SS, FN-100SSD, FN-180SS, FN-180SSD, F-190D, F-260D, F-2800D), product names manufactured by Japan Fillite Company "Expancel" (Grade: 053-40, 031-40, 920-40, 909-80, 930-120), "Daifoam" manufactured by Kureha Chemical Industry Co., Ltd. (Grade: H750, H850, H1100, S2320D, S2640D, M330, M430, M520), "AdvanCell" manufactured by Sekisui Chemical Industry Co., Ltd. (Grade: EML101, EMH204, EHM301, EHM302, EHM303, EM304, EHM401, EM403, EM501), etc.

上述熱膨脹性微小球之加熱前之粒徑較佳為0.5 μm~80 μm,更佳為5 μm~45 μm,進而較佳為10 μm~20 μm,尤佳為10 μm~15 μm。因此,若以平均粒徑稱呼上述熱膨脹性微小球之加熱前之粒子尺寸,則較佳為6 μm~45 μm,更佳為15 μm~35 μm。上述粒徑及平均粒徑係藉由雷射散射法中之粒度分佈測定法而求出之值。The particle size of the thermally expandable microspheres before heating is preferably 0.5 μm to 80 μm, more preferably 5 μm to 45 μm, further preferably 10 μm to 20 μm, particularly preferably 10 μm to 15 μm. Therefore, when the particle size of the thermally expandable microspheres before heating is referred to as the average particle diameter, it is preferably 6 μm to 45 μm, more preferably 15 μm to 35 μm. The above-mentioned particle diameter and average particle diameter are values determined by the particle size distribution measurement method in the laser scattering method.

包含含有熱膨脹性微小球之黏著劑之黏著劑層之厚度例如可設為3 μm以上,並無特別限定。就抑制由含有熱膨脹性微小球所引起之黏著面之平滑性降低之觀點而言,上述黏著劑層之厚度通常為7 μm以上較為適當,較佳為超過10 μm,亦可為超過15 μm,亦可為超過25 μm,亦可為超過35 μm。上述黏著劑層之厚度之上限通常為300 μm以下較為適當,亦可為200 μm以下,亦可為150 μm以下,亦可為100 μm以下,亦可為70 μm以下,並無特別限制。關於黏著劑層之厚度不過大,就避免黏著劑層因熱膨脹性微小球之膨脹而凝集破壞之觀點而言,黏著劑層之厚度不過大可變得有利。於若干態樣中,黏著劑層之厚度亦可為60 μm以下,亦可為50 μm以下,亦可為45 μm以下。The thickness of the adhesive layer including the adhesive containing thermally expandable microspheres can be, for example, 3 μm or more, and is not particularly limited. From the viewpoint of suppressing the decrease in smoothness of the adhesive surface caused by the inclusion of thermally expandable microballoons, the thickness of the adhesive layer is usually more than 7 μm, preferably more than 10 μm, and may be more than 15 μm. It may be more than 25 μm or more than 35 μm. The upper limit of the thickness of the above-mentioned adhesive layer is usually 300 μm or less, which is more appropriate. It may be 200 μm or less, it may be 150 μm or less, it may be 100 μm or less, it may be 70 μm or less, and there is no particular limit. Regarding the thickness of the adhesive layer not being too large, it is advantageous to prevent the adhesive layer from being agglomerated and destroyed due to the expansion of thermally expandable microspheres. In some aspects, the thickness of the adhesive layer may be less than 60 μm, may be less than 50 μm, or may be less than 45 μm.

上述黏著劑層之厚度Ta較佳為大於熱膨脹性微小球之加熱前之平均粒徑D。即,較佳為Ta/D大於1.0。就黏著面之平滑性之觀點而言,於若干態樣中,Ta/D較佳為2.0以上,亦可為3.0以上,亦可為4.0以上。又,就容易發揮由熱膨脹性微小球之膨脹所引起之剝離效果之觀點而言,Ta/D通常為50以下較為適當,較佳為20以下,亦可為15以下,亦可為10以下。The thickness Ta of the adhesive layer is preferably greater than the average particle diameter D of the thermally expandable microspheres before heating. That is, it is preferable that Ta/D is larger than 1.0. From the viewpoint of the smoothness of the adhesive surface, in some aspects, Ta/D is preferably 2.0 or more, may be 3.0 or more, or may be 4.0 or more. In addition, from the viewpoint of easily exhibiting the peeling effect caused by the expansion of the thermally expandable microspheres, Ta/D is usually 50 or less, preferably 20 or less, and may be 15 or less, or may be 10 or less.

上述熱膨脹性微小球較佳為具有適宜之強度以在體積膨脹率達到較佳為5倍以上、更佳為7倍以上、進而較佳為10倍以上之前不會破裂。於使用此種熱膨脹性微小球之情形時,可藉由加熱處理而高效率地降低黏著力。The thermally expandable microspheres preferably have appropriate strength so that they will not break before the volume expansion rate reaches preferably 5 times or more, more preferably 7 times or more, and further preferably 10 times or more. When using such thermally expandable microballoons, the adhesive force can be efficiently reduced by heat treatment.

包含熱膨脹性微小球之黏著劑中之該熱膨脹性微小球之含有比例可根據所需之黏著力之降低性等而適當進行設定。關於熱膨脹性微小球之含有比例,相對於包含該熱膨脹性微小球之黏著劑之基礎聚合物100重量份,熱膨脹性微小球之含有比例例如為1重量份~150重量份,較佳為10重量份~130重量份,進而較佳為20重量份~100重量份。The content ratio of the heat-expandable microspheres in the adhesive containing the heat-expandable microspheres can be appropriately set depending on the required reduction in adhesive force, etc. Regarding the content ratio of the heat-expandable microspheres, the content ratio of the heat-expandable microspheres is, for example, 1 to 150 parts by weight, preferably 10 parts by weight, relative to 100 parts by weight of the base polymer of the adhesive agent containing the heat-expandable microspheres. parts to 130 parts by weight, and more preferably 20 parts to 100 parts by weight.

於構成第2黏著劑層之表面之黏著劑包含熱膨脹性微小球之情形時,熱膨脹性微小球膨脹之前(即,加熱前)之上述第2黏著劑層表面之算術平均粗糙度Ra較佳為500 nm以下,更佳為400 nm以下,進而較佳為300 nm以下。若為此種範圍,則可獲得在上述第2黏著劑層側對於被黏著體之密接性優異之黏著片材。如此表面平滑性優異之第2黏著劑層例如可藉由如下等方式獲得:將黏著劑層之厚度設為上述範圍;將包含熱膨脹性微小球之黏著劑組合物塗佈於剝離襯墊並進行乾燥,將所形成之黏著劑層直接轉印於基材或轉印於設置於該基材上之中間層(例如彈性中間層)上。When the adhesive constituting the surface of the second adhesive layer contains thermally expandable microspheres, the arithmetic mean roughness Ra of the surface of the second adhesive layer before expansion of the thermally expandable microspheres (that is, before heating) is preferably: 500 nm or less, more preferably 400 nm or less, further preferably 300 nm or less. If it is within this range, an adhesive sheet having excellent adhesion to the adherend on the side of the second adhesive layer can be obtained. Such a second adhesive layer with excellent surface smoothness can be obtained, for example, by: setting the thickness of the adhesive layer to the above range; applying an adhesive composition containing thermally expandable microspheres to a release liner and performing After drying, the formed adhesive layer is directly transferred to the substrate or transferred to an intermediate layer (such as an elastic intermediate layer) provided on the substrate.

於第2黏著劑層包含熱膨脹性微小球之情形時,上述黏著劑層較佳為含有包含80℃下之動態儲存模數處於5 kPa~1 MPa(更佳為10 kPa~0.8 MPa)之範圍內之基礎聚合物的黏著劑。若為此種黏著劑層,則可形成在加熱前具有適度黏著性且容易藉由加熱而降低黏著力之黏著片材。再者,動態儲存模數可使用動態黏彈性測定裝置(例如,Rheometrics公司製造之商品名「ARES」)於頻率1 Hz、升溫速度10℃/min之測定條件下進行測定。When the second adhesive layer contains thermally expandable microspheres, the adhesive layer preferably contains a dynamic storage modulus in the range of 5 kPa to 1 MPa (more preferably 10 kPa to 0.8 MPa) at 80°C. Adhesive within the base polymer. With such an adhesive layer, an adhesive sheet can be formed that has moderate adhesiveness before heating and can easily reduce adhesive force by heating. Furthermore, the dynamic storage modulus can be measured using a dynamic viscoelasticity measuring device (for example, trade name "ARES" manufactured by Rheometrics) under the measurement conditions of a frequency of 1 Hz and a temperature rise rate of 10°C/min.

<黏著片材之製造方法> 本發明之黏著片材可藉由任意適當之方法製造。本發明之黏著片材例如可藉由如下方式製造:將包含黏著劑層(可為第1黏著劑層、構成該第1黏著劑層之A層或B層、第2黏著劑層等)形成成分之黏著劑組合物直接塗敷於基材或直接塗敷於設置於該基材上之中間層(例如B層、彈性中間層等)而形成黏著劑層之方法;將黏著劑組合物塗敷於任意適當之剝離性工藝材料(例如剝離襯墊)上而於該剝離性工藝材料上形成黏著劑層,將上述黏著劑層轉印於基材或該基材上之中間層之方法;該等之組合;等。上述黏著劑組合物可為包含任意適當之溶劑之溶劑型黏著劑組合物。 <Manufacturing method of adhesive sheet> The adhesive sheet of the present invention can be produced by any suitable method. The adhesive sheet of the present invention can be produced, for example, by forming an adhesive layer (which may be a first adhesive layer, layer A or layer B constituting the first adhesive layer, a second adhesive layer, etc.) A method in which the adhesive composition of the ingredients is directly coated on the base material or on an intermediate layer (such as B layer, elastic intermediate layer, etc.) provided on the base material to form an adhesive layer; applying the adhesive composition A method of applying any appropriate release process material (such as a release liner) to form an adhesive layer on the release process material, and transferring the adhesive layer to the base material or the intermediate layer on the base material; Combinations of such; etc. The above-mentioned adhesive composition may be a solvent-based adhesive composition containing any suitable solvent.

於形成包含熱膨脹性微小球之黏著劑層之情形時,可將包含熱膨脹性微小球、黏著劑及任意適當之溶劑之組合物塗敷於基材,形成該黏著劑層。或,亦可將熱膨脹性微小球撒至黏著劑塗敷層後,使用貼合機等,將該熱膨脹性微小球嵌埋至黏著劑中,形成包含熱膨脹性微小球之黏著劑層。When forming an adhesive layer containing thermally expandable microspheres, a composition containing thermally expandable microspheres, an adhesive, and any appropriate solvent can be applied to the substrate to form the adhesive layer. Alternatively, the thermally expandable microspheres may be sprinkled onto the adhesive coating layer, and then a laminating machine or the like may be used to embed the thermally expandable microspheres in the adhesive to form an adhesive layer containing the thermally expandable microspheres.

作為上述黏著劑及各組合物之塗敷方法,可採用任意適當之塗敷方法。例如,可於塗佈後進行乾燥而形成各層。作為塗佈方法,例如可例舉:使用多功能塗佈機、模嘴塗佈機、凹版塗佈機、敷貼器等之塗佈方法。作為乾燥方法,例如可例舉:自然乾燥、加熱乾燥等。進行加熱乾燥之情形時之加熱溫度可根據成為乾燥對象之物質之特性而設定為任意適當之溫度。 [實施例] As the coating method of the above-mentioned adhesive and each composition, any appropriate coating method can be used. For example, each layer can be formed by drying after coating. Examples of the coating method include a coating method using a multifunctional coater, a die coater, a gravure coater, an applicator, and the like. Examples of drying methods include natural drying, heat drying, and the like. The heating temperature when performing heat drying can be set to any appropriate temperature according to the characteristics of the substance to be dried. [Example]

以下,對與本發明相關之若干實施例進行說明,但並不意圖將本發明限定於該具體例中所示者。再者,於以下之說明中,「份」及「%」只要沒有特別說明則為重量基準。Several embodiments related to the present invention will be described below, but the present invention is not intended to be limited to those shown in the specific examples. In addition, in the following description, "parts" and "%" are based on weight unless otherwise specified.

<評價方法> 1.壓痕硬度 使用Hysitron公司製造之奈米壓痕儀、製品名「Triboindenter TI-950」,藉由上述方法測定壓痕硬度H1、H2。 <Evaluation method> 1. Indentation hardness The indentation hardness H1 and H2 were measured by the above method using a nanoindentation instrument manufactured by Hysitron Corporation, product name "Triboindenter TI-950".

2.拉絲性 使用Hysitron公司製造之奈米壓痕儀、製品名「Triboindenter TI-950」,藉由上述方法測定拉絲性D1、D2。 2. Drawnability A nanoindentation instrument manufactured by Hysitron Corporation, product name "Triboindenter TI-950" was used to measure drawability D1 and D2 by the above method.

3.膨潤試驗 使用注射器(注射器直徑:22 mm),將4-第三丁基苯基縮水甘油醚(TBPGE)0.02 g滴下至第1黏著劑層之表面,於23℃、50%RH之環境下靜置1分鐘。用碎布吸收殘留於黏著劑層表面之TBPGE將之去除後,測定滴下TBPGE之部位中之黏著劑層之厚度T1[μm]。根據TBPGE滴下前之該部位之黏著劑層之厚度(初始厚度)T0[μm]與上述厚度T1[μm],藉由以下之式算出黏著劑層之厚度變化量及厚度變化率。 厚度變化量[μm]=T1-T0 厚度變化率[%]=((T1-T0)/T0)×100 3. Swelling test Using a syringe (syringe diameter: 22 mm), drop 0.02 g of 4-tert-butylphenyl glycidyl ether (TBPGE) onto the surface of the first adhesive layer, and let it stand for 1 hour in an environment of 23°C and 50%RH. minute. Use a rag to absorb the TBPGE remaining on the surface of the adhesive layer to remove it, and then measure the thickness T1 [μm] of the adhesive layer in the area where TBPGE was dropped. Based on the thickness (initial thickness) T0 [μm] of the adhesive layer at the site before TBPGE is dropped and the above-mentioned thickness T1 [μm], the thickness change amount and thickness change rate of the adhesive layer are calculated by the following formula. Thickness change [μm]=T1-T0 Thickness change rate [%] = ((T1-T0)/T0)×100

4.TMA沉入量 使用TA instruments公司製造之熱機械分析裝置、製品名「TMA Q400」,於探針:針入(圓柱狀、前端直徑1 mmΦ)、氮氣流量:50.0 ml/min、壓入負載:0.01 N、測定氛圍溫度:23.0℃、壓入負荷時間:60 min之條件下,測定自第1黏著劑層之表面之沉入量。測定係以N=5進行實施,將自該等測定值去除最大值及最小值所得之N=3之平均值設為TMA沉入量。 再者,於為黏著片材僅在基材之單側具有黏著劑層(第1黏著劑層),在基材之相反側(背面側)不具有第2黏著劑層之構成之情形時,關於該黏著片材,於上述基材之背面側形成上述標準黏著劑層(相對於EA/2EHA/MMA/HEA=30/70/5/5(重量比)之丙烯酸系聚合物100份,含有黏著賦予劑10份、異氰酸酯系交聯劑2份、熱膨脹性微小球30份之黏著劑層。厚度45 μm)後,進行TMA沉入量之測定。 4.TMA sinking amount Use a thermomechanical analysis device manufactured by TA Instruments, product name "TMA Q400", with probe: needle insertion (cylindrical shape, tip diameter 1 mmΦ), nitrogen gas flow rate: 50.0 ml/min, intrusion load: 0.01 N, and measurement Under the conditions of atmosphere temperature: 23.0°C and press-in load time: 60 minutes, measure the sinking amount from the surface of the first adhesive layer. The measurement was performed with N=5, and the average value of N=3 obtained by excluding the maximum value and the minimum value from these measured values was taken as the TMA sinking amount. Furthermore, in the case where the adhesive sheet has an adhesive layer (first adhesive layer) only on one side of the base material and does not have a second adhesive layer on the opposite side (back side) of the base material, Regarding this adhesive sheet, the above-mentioned standard adhesive layer (100 parts of acrylic polymer based on EA/2EHA/MMA/HEA=30/70/5/5 (weight ratio)) was formed on the back side of the above-mentioned base material, containing After forming an adhesive layer of 10 parts of adhesive imparting agent, 2 parts of isocyanate cross-linking agent, and 30 parts of heat-expandable microspheres (thickness: 45 μm), the amount of TMA sinking was measured.

5.弛豫時間 自構成A層之黏著劑層挑選收集約100 mg之黏著劑,藉由將其作為測定樣品之脈衝NMR測定,獲得T 2弛豫曲線。使用上述式(1),藉由解析軟體(TDNMR-A)進行擬合,近似於1個成分(α)進行解析,藉此求出S成分之T 2弛豫時間。再者,Wa全部解析為1。將藉由上述解析方法所算出之弛豫時間中最短者設為A層之利用脈衝NMR所得之S成分之T 2弛豫時間(T 2s)。以同樣之方式求出B層之利用脈衝NMR所得之S成分之T 2弛豫時間(T 2s)。再者,關於脈衝NMR測定,使用Bruker公司製造之時域NMR裝置、裝置名「TD-NMR the minispec mq20」,於90°脈衝寬度2.1 μ秒、重複時間1秒、累計次數32次、測定溫度30℃之條件下,藉由Solid Echo法進行脈衝NMR測定。 5. Relaxation time: Select and collect about 100 mg of adhesive from the adhesive layer that constitutes layer A, and measure the T 2 relaxation curve by using it as a measurement sample for pulse NMR measurement. Using the above formula (1), fitting is performed by analysis software (TDNMR-A), and the T 2 relaxation time of the S component is obtained by analyzing it approximately to one component (α). Furthermore, Wa all resolves to 1. The shortest one among the relaxation times calculated by the above analysis method is defined as the T 2 relaxation time (T 2s ) of the S component of the A layer obtained by pulse NMR. In the same manner, the T 2 relaxation time (T 2s ) of the S component of the B layer obtained by pulse NMR was obtained. In addition, regarding the pulse NMR measurement, a time domain NMR device manufactured by Bruker Corporation, device name "TD-NMR the minispec mq20" was used, and the temperature was measured at a 90° pulse width of 2.1 μ seconds, a repetition time of 1 second, and a cumulative count of 32 times. Pulse NMR measurement was performed by Solid Echo method at 30°C.

6.對於PET之黏著力 將黏著片材裁斷成寬度20 mm、長度140 mm之尺寸,使用2 kg之手壓輥將其背面側(與設置有第1黏著劑層之側相反一側)之整個面經由雙面膠帶(日東電工公司製造,商品名「No.531」)貼合於SUS304板。關於在基材之背面側具有第2黏著劑層之構成之黏著片材,經由上述第2黏著劑層來代替使用上述No.531雙面膠帶將上述黏著片材之背面側貼合於SUS304板。 於23℃、50%RH之環境下,將作為被黏著體之聚對苯二甲酸乙二酯(PET)膜(東麗公司製造,商品名「Lumirror S-10」,厚度25 μm,寬度30 mm)以2 kg之輥進行1個往返之方式貼合於如上所述背面側固定在SUS304板之黏著片材之黏著面。將其於上述環境下放置30分鐘後,使用拉伸試驗機,於剝離角度180度、拉伸速度300 mm/分鐘之條件下測定自上述黏著片材剝離上述PET膜時之負載,將此時之平均負載設為黏著片材對於PET之黏著力。作為上述拉伸試驗機,使用島津製作公司製造之商品名「Autograph AG-120kN」。 6. Adhesion to PET Cut the adhesive sheet into a size of 20 mm in width and 140 mm in length, and use a 2 kg hand roller to cover the entire back side (the side opposite to the side where the first adhesive layer is provided) with double-sided tape ( Manufactured by Nitto Denko Co., Ltd., trade name "No.531") and bonded to the SUS304 board. Regarding the adhesive sheet having a second adhesive layer on the back side of the base material, the back side of the adhesive sheet is bonded to the SUS304 board via the second adhesive layer instead of using the No. 531 double-sided tape. . In an environment of 23°C and 50% RH, the polyethylene terephthalate (PET) film (manufactured by Toray Corporation, trade name "Lumirror S-10", thickness 25 μm, width 30 mm) is attached to the adhesive surface of the adhesive sheet fixed to the SUS304 board on the back side as described above using a 2 kg roller in one round trip. After leaving it in the above environment for 30 minutes, use a tensile testing machine to measure the load when the PET film is peeled off from the adhesive sheet at a peeling angle of 180 degrees and a tensile speed of 300 mm/min. The average load is set as the adhesive force of the adhesive sheet to PET. As the above-mentioned tensile testing machine, a trade name "Autograph AG-120kN" manufactured by Shimadzu Corporation was used.

7.加熱後抓固力 將黏著片材裁斷成寬度20 mm、長度140 mm之尺寸,使用2 kg之手壓輥將其背面側(與設置有第1黏著劑層之側相反一側)之整個面經由雙面膠帶(日東電工公司製造,商品名「No.531」)貼合於SUS304板。關於在基材之背面側具有第2黏著劑層之構成之黏著片材,經由上述第2黏著劑層來代替使用上述No.531雙面膠帶將上述黏著片材貼合於SUS304板。將其於150℃之環境下保持1小時後,於23℃、50%RH之環境下靜置2小時。其次,於23℃、50%RH之環境下,使用截切刀,進行自第1黏著劑層之表面至基材表面之深度之切割,將市售之丙烯酸系膠帶(日東電工公司製造,商品名:No.315)以2 kg輥進行1個往返之方式壓接於其上,靜置30分鐘。其後,使用上述拉伸試驗機,於剝離角度180度、拉伸速度50 mm/分鐘之條件下測定剝離上述丙烯酸系膠帶時之負載,記錄此時之最大負載作為加熱後抓固力。 7. Grip after heating Cut the adhesive sheet into a size of 20 mm in width and 140 mm in length, and use a 2 kg hand roller to cover the entire back side (the side opposite to the side where the first adhesive layer is provided) with double-sided tape ( Manufactured by Nitto Denko Co., Ltd., trade name "No.531") and bonded to the SUS304 board. Regarding the adhesive sheet having a second adhesive layer on the back side of the base material, the adhesive sheet was bonded to the SUS304 board via the second adhesive layer instead of using the No. 531 double-sided tape. After maintaining it in an environment of 150°C for 1 hour, let it stand in an environment of 23°C and 50%RH for 2 hours. Next, in an environment of 23°C and 50% RH, use a cutter to cut a depth from the surface of the first adhesive layer to the surface of the base material, and cut a commercially available acrylic tape (manufactured by Nitto Denko Co., Ltd. Name: No.315) Use a 2 kg roller to press it in one round trip and let it sit for 30 minutes. Thereafter, the tensile testing machine was used to measure the load when peeling off the acrylic tape at a peeling angle of 180 degrees and a stretching speed of 50 mm/min, and the maximum load at this time was recorded as the post-heating gripping force.

8.對於密封樹脂之黏著力 將黏著片材裁斷成寬度50 mm、長度140 mm之尺寸,將模框(開口尺寸:寬度35 mm、長度90 mm之長方形,厚度:564 μm)貼合於該第1黏著劑層上。將顆粒狀之環氧樹脂系密封材(住友電木公司製造,G730)以硬化後之樹脂厚度成為0.3 mm之方式散佈於上述模框內後,蓋上經矽酮處理之剝離襯墊,使用Meisho-press公司製造之「油壓成形機NS-VPF-50」,於溫度145℃、成形時間600秒、加壓條件0.3 MPa(300 mm見方之平台尺寸)、真空時間600秒、真空度-0.1 MPa之條件下,於第1黏著層上加熱密封樹脂並使之成形。將其於150℃下加熱7小時使密封樹脂硬化,其次,於23℃、50%RH之環境下靜置2小時後,將密封樹脂與第1黏著劑層接觸之部分切割成寬度20 mm、長度88 mm之尺寸,製作評價用試樣。將該評價用試樣於23℃、50%RH之環境下放置30分鐘後,使用上述拉伸試驗機,於剝離角度180度、拉伸速度300 mm/分鐘之條件下測定自密封樹脂剝離黏著片材時之負載,將此時之平均負載設為黏著片材對於密封樹脂之黏著力。 8. Adhesion to sealing resin Cut the adhesive sheet into a size of 50 mm width and 140 mm length, and attach the mold frame (opening size: rectangle with width 35 mm and length 90 mm, thickness: 564 μm) to the first adhesive layer. Spread granular epoxy resin sealing material (G730 manufactured by Sumitomo Bakelite Co., Ltd.) in the above mold frame so that the thickness of the cured resin becomes 0.3 mm, cover it with a silicone-treated release liner, and use "Hydraulic forming machine NS-VPF-50" manufactured by Meisho-press Company operates at a temperature of 145°C, a forming time of 600 seconds, a pressure condition of 0.3 MPa (300 mm square platform size), a vacuum time of 600 seconds, and a vacuum degree of - Under the condition of 0.1 MPa, heat the sealing resin on the first adhesive layer and form it. Heat it at 150°C for 7 hours to harden the sealing resin. Next, after leaving it for 2 hours in an environment of 23°C and 50% RH, cut the part of the sealing resin in contact with the first adhesive layer into a width of 20 mm. The size of the length is 88 mm, and a sample for evaluation is prepared. After the evaluation sample was placed in an environment of 23°C and 50% RH for 30 minutes, the self-sealing resin peel adhesion was measured using the above-mentioned tensile testing machine at a peeling angle of 180 degrees and a tensile speed of 300 mm/min. The load at the time of sheet material, let the average load at this time be the adhesion force of the adhesive sheet to the sealing resin.

9.糊劑殘留防止性 於上述密封樹脂黏著力之測定中,藉由目測觀察來確認有無糊劑殘留於剝離黏著片材後之密封樹脂上。基於該結果,於確認有糊劑殘留之情形時,判定為糊劑殘留防止性「P」(Poor:糊劑殘留防止性不足),於未確認有糊劑殘留之情形時,判定為糊劑殘留防止性「G」(Good:糊劑殘留防止性良好)。 9. Paste residue prevention In the above-mentioned measurement of the adhesive force of the sealing resin, visual inspection was performed to confirm whether there was any paste remaining on the sealing resin after peeling off the adhesive sheet. Based on the results, when the presence of paste residue is confirmed, it is determined that the prevention of paste residue is "P" (Poor: Insufficient prevention of paste residue), and when the presence of paste residue is not confirmed, it is determined that the prevention of paste residue is "P" Preventive property "G" (Good: Paste residue prevention property is good).

10.模型溢料評價 於黏著片材之第1黏著面上,於下述條件下實施半導體晶片(Si晶片)之樹脂密封步驟,對防止密封樹脂侵入至晶片與密封樹脂之界面(模型溢料)之性能進行評價。 載具:SUS製載具(220 mmΦ) 晶片:附階差之虛設晶片(在7 mm×7 mm×400 μm厚之矽基板之單面具有銅製墊(墊目標高度5.5 μm,遮罩:GNC-300 mm-G03-A-300S)之虛設晶片。Globalnet公司製造) 接合裝置:東麗工程公司公司製造之FC3000W 接合條件:壓接時間6秒、壓接壓力10 N、壓接溫度:23℃ 密封設備:Apic Yamada公司製造之MS-150HP 密封樹脂:住友電木公司製造之G730 預熱條件:130℃×30秒 自預熱至開始密封之時間:1小時 密封溫度:145℃ 真空時間:5秒 密封時間:600秒 鎖模力:3.6 MPa 密封厚度:600 μm 10. Model overflow evaluation On the first adhesive surface of the adhesive sheet, the resin sealing step of the semiconductor wafer (Si wafer) was carried out under the following conditions, and the performance of preventing the sealing resin from intruding into the interface between the chip and the sealing resin (model flash) was evaluated. Vehicle: SUS vehicle (220 mmΦ) Chip: Dummy chip with step difference (with copper pad on one side of a 7 mm×7 mm×400 μm thick silicon substrate (pad target height 5.5 μm, mask: GNC-300 mm-G03-A-300S) Dummy chip. Manufactured by Globalnet Corporation) Bonding device: FC3000W manufactured by Toray Engineering Co., Ltd. Joining conditions: crimping time 6 seconds, crimping pressure 10 N, crimping temperature: 23°C Sealing equipment: MS-150HP manufactured by Apic Yamada Company Sealing resin: G730 manufactured by Sumitomo Bakelite Co., Ltd. Preheating conditions: 130℃×30 seconds Time from preheating to sealing start: 1 hour Sealing temperature: 145℃ Vacuum time: 5 seconds Sealing time: 600 seconds Clamping force: 3.6 MPa Sealing thickness: 600 μm

密封作業係按照以下之順序來實施。 1)將黏著片材之背面側經由含有熱膨脹性微小球之黏著劑層貼附於SUS載具(貼附條件:23℃氛圍下、貼附汽缸壓力0.1 MPa、貼附速度0.5 m/min)。 作為上述含有熱膨脹性微小球之黏著劑層,關於在基材之背面側具有含有熱膨脹性微小球之第2黏著劑層之構成之黏著片材,直接利用該第2黏著劑層。關於在基材之背面側不具有第2黏著劑層之構成之黏著片材,於上述基材之背面側形成上述標準黏著劑層(含有相對於丙烯酸系聚合物100份為30份之熱膨脹性微小球(松本油脂製藥公司製造,商品名「Matsumoto Microsphere F-190D」)之黏著劑層;厚度45 μm),經由該標準黏著劑層將上述黏著片材之背面側固定於SUS載具。 2)於固定於SUS載具之黏著片材之第1黏著劑層上,使用上述接合裝置,以如下方式配置合計25個上述附階差之虛設晶片,即沿著中心角45度之8根放射狀直線進行配置且間隔自中心向外周逐漸變大。上述晶片之朝向係設為如下朝向,即該晶片之階差面(墊形成面)與第1黏著劑層相對。 3)將在黏著片材之第1黏著劑層上配置有附階差之虛設晶片之狀態之SUS載具於特定之條件下進行預熱。 4)於預熱後,於23℃、50%RH之環境下靜置1小時後,自上述虛設晶片之上用手均勻地塗抹特定之密封樹脂,藉由特定之密封設備於密封條件下進行密封。 5)將所獲得之積層體於150℃下加熱4小時使密封樹脂硬化。 6)將加熱硬化之積層體於23℃、50%RH之環境下放置5天後,於加熱板上進行加熱,藉此使在SUS載具上固定有黏著片材之黏著劑層中之熱膨脹性微小球膨脹,自上述積層體分離SUS載具。 7)自分離了SUS載具後之積層體剝離黏著片材,獲得包含密封樹脂及附階差之虛設晶片之構造體。 The sealing operation is carried out in the following order. 1) Attach the back side of the adhesive sheet to the SUS carrier through the adhesive layer containing thermally expandable microspheres (attachment conditions: 23°C atmosphere, attachment cylinder pressure 0.1 MPa, attachment speed 0.5 m/min) . As the adhesive layer containing thermally expandable microspheres, for an adhesive sheet having a second adhesive layer containing thermally expandable microspheres on the back side of the base material, the second adhesive layer is directly used. For an adhesive sheet that does not have a second adhesive layer on the back side of the base material, the above-mentioned standard adhesive layer (containing 30 parts of thermal expansion with respect to 100 parts of the acrylic polymer) is formed on the back side of the base material. The adhesive layer of microspheres (trade name "Matsumoto Microsphere F-190D" manufactured by Matsumoto Oil Pharmaceutical Co., Ltd.; thickness 45 μm) is used to fix the back side of the above-mentioned adhesive sheet to the SUS carrier through this standard adhesive layer. 2) On the first adhesive layer of the adhesive sheet fixed on the SUS carrier, use the above-mentioned bonding device to arrange a total of 25 dummy wafers with the above-mentioned steps in the following manner, that is, 8 wafers along the central angle of 45 degrees Radial straight lines are arranged with intervals gradually becoming larger from the center to the outer periphery. The orientation of the wafer is such that the step surface (pad formation surface) of the wafer faces the first adhesive layer. 3) Preheat the SUS carrier with a stepped dummy chip placed on the first adhesive layer of the adhesive sheet under specific conditions. 4) After preheating, let it stand for 1 hour in an environment of 23°C and 50% RH. Apply a specific sealing resin evenly by hand from the above-mentioned dummy chip, and use a specific sealing equipment to perform the process under sealing conditions. seal. 5) The obtained laminated body was heated at 150° C. for 4 hours to harden the sealing resin. 6) Place the heat-hardened laminate in an environment of 23°C and 50% RH for 5 days, and then heat it on a hot plate to cause thermal expansion in the adhesive layer where the adhesive sheet is fixed on the SUS carrier. The microscopic balls expand and the SUS carrier is separated from the above-mentioned laminate. 7) Peel off the adhesive sheet from the laminated body after separating the SUS carrier, and obtain a structure including a sealing resin and a dummy wafer with a step.

關於上述構造體,藉由雷射共焦顯微鏡(OLS-4000 OLYMPUS製造)觀察與上述第1黏著面相接之表面,確認密封樹脂有無侵入至附階差之虛設晶片上。於在上述表面上確認有黏著劑之殘渣物(糊劑殘留)等之情形時,使用甲苯去除殘渣物後進行觀察。結果,於所有虛設晶片中均觀察到密封樹脂侵入之情形時,判定為「P」(Poor:模型溢料防止性不足),於所有虛設晶片中均未觀察到密封樹脂侵入之情形時,判定為「G」(Good:模型溢料防止性良好)。Regarding the above-mentioned structure, the surface in contact with the above-mentioned first adhesive surface was observed with a laser confocal microscope (OLS-4000 manufactured by OLYMPUS) to confirm whether the sealing resin had penetrated into the dummy wafer with the step. If residue of adhesive (paste residue) is found on the above surface, remove the residue with toluene and observe it. As a result, when sealing resin penetration is observed in all dummy wafers, the judgment is "P" (Poor: Insufficient model flash prevention). When sealing resin penetration is not observed in all dummy wafers, the judgment is "P" (Poor: insufficient model flash prevention). It is "G" (Good: the model has good anti-spill properties).

11.間隙評價 於黏著片材之第1黏著面上,除了使用Si鏡面晶片(7 mm×7 mm×400 μm厚)作為半導體晶片(Si晶片)以外,以與上述模型溢料評價相同之方式實施半導體晶片(Si晶片)之樹脂密封步驟,獲得包含密封樹脂及Si鏡面晶片之構造體。 關於該構造體,藉由雷射共焦顯微鏡(OLS-4000 OLYMPUS製造)觀察與上述第1黏著面相接之表面,將配置於中心之Si晶片作為對象,測量上述表面中之Si晶片與密封樹脂之界面之階差高度(間隙高度)。於在上述表面上確認有黏著劑之殘渣物(糊劑殘留)等之情形時,使用甲苯去除殘渣物後進行測量。結果,於間隙高度未達3.3 μm之情形時,判定為「G」(Good:間隙被良好抑制),於間隙高度為3.3 μm以上之情形時,判定為「P」(Poor:間隙之抑制不充分)。 11. Gap evaluation On the first adhesive surface of the adhesive sheet, except that a Si mirror wafer (7 mm × 7 mm × 400 μm thick) is used as the semiconductor wafer (Si wafer), the semiconductor wafer (Si wafer) is implemented in the same manner as the above model flash evaluation. Si wafer), a structure including a sealing resin and a Si mirror wafer is obtained. Regarding this structure, the surface in contact with the above-mentioned first adhesive surface was observed with a laser confocal microscope (OLS-4000 manufactured by OLYMPUS), and the Si wafer placed in the center was used as an object, and the Si wafer and seal on the above-mentioned surface were measured. The step height (gap height) of the resin interface. When adhesive residue (paste residue), etc. is confirmed on the above surface, use toluene to remove the residue and then perform measurement. As a result, when the gap height is less than 3.3 μm, it is judged as "G" (Good: the gap is well suppressed), and when the gap height is 3.3 μm or more, it is judged as "P" (Poor: The gap is not suppressed well). full).

<例1> 於包含聚合物P1(包含丙烯酸2-乙基己酯(2EHA)/丙烯酸(AA)=95/5(重量比)之單體成分之丙烯酸系聚合物。SP值19.3)100份之甲苯溶液中加入環氧系交聯劑(三菱瓦斯化學公司製造,商品名「Tetrad C」)5份、稀釋用之甲苯(合計100份之量)進行混合,製備黏著劑組合物1a。將該黏著劑組合物1a塗佈於單面包含利用矽酮系剝離處理劑實施了剝離處理之聚對苯二甲酸乙二酯(PET)之剝離膜R1(東麗膜加工公司製造,商品名「Cerapeel MDAR」,厚度38 μm)之剝離處理面並進行乾燥,在上述剝離膜R1上形成黏著劑層1A(厚度L1=10 μm)。 除將環氧系交聯劑5份變更成異氰酸酯系交聯劑(東曹公司製造,商品名「Coronate L」)3份以外,以與黏著劑組合物1a之製備相同之方式製備黏著劑組合物1b。將該黏著劑組合物1b塗佈於作為基材之PET膜(東麗公司製造,商品名「Lumirror S10」,厚度38 μm)之單面並進行乾燥,藉此在上述基材之單面上形成黏著劑層1B(厚度L2=10 μm)。 將形成於上述剝離膜R1上之黏著劑層1A之黏著面貼合於上述黏著劑層1B之黏著面,藉此獲得包含黏著劑層1B及黏著劑層1A之第1黏著劑層配置在上述基材之單面的黏著片材(具有基材/黏著劑層1B(B層)/黏著劑層1A(A層)之構成之黏著片材)。 <Example 1> In a toluene solution containing 100 parts of polymer P1 (an acrylic polymer containing monomer components of 2-ethylhexyl acrylate (2EHA)/acrylic acid (AA) = 95/5 (weight ratio). SP value: 19.3) 5 parts of an epoxy cross-linking agent (manufactured by Mitsubishi Gas Chemical Co., Ltd., trade name "Tetrad C") and toluene for dilution (100 parts in total) were added and mixed to prepare an adhesive composition 1a. This adhesive composition 1a was applied to a release film R1 (manufactured by Toray Film Processing Co., Ltd., trade name) containing polyethylene terephthalate (PET) that has been released on one side with a silicone-based release treatment agent. "Cerapeel MDAR", thickness 38 μm) on the peeling surface and dried to form an adhesive layer 1A (thickness L1 = 10 μm) on the above-mentioned peeling film R1. An adhesive composition was prepared in the same manner as the adhesive composition 1a except that 5 parts of the epoxy cross-linking agent was changed to 3 parts of an isocyanate cross-linking agent (manufactured by Tosoh Corporation, trade name "Coronate L") Thing 1b. The adhesive composition 1b was applied to one side of a PET film (manufactured by Toray Corporation, trade name "Lumirror S10", thickness 38 μm) as a base material and dried, thereby forming a layer of adhesive composition 1b on one side of the base material. Adhesive layer 1B (thickness L2 = 10 μm) is formed. The adhesive surface of the adhesive layer 1A formed on the above-mentioned release film R1 is bonded to the adhesive surface of the above-mentioned adhesive layer 1B, thereby obtaining a first adhesive layer including the adhesive layer 1B and the adhesive layer 1A arranged on the above-mentioned A single-sided adhesive sheet of a base material (an adhesive sheet consisting of base material/adhesive layer 1B (B layer)/adhesive layer 1A (A layer)).

<例2> 除將交聯劑之使用量及A層、B層之厚度設為如表1所示以外,以與例1相同之方式獲得具有基材/黏著劑層2B(B層)/黏著劑層2A(A層)之構成之黏著片材。 <Example 2> Except that the usage amount of the cross-linking agent and the thickness of layer A and layer B are as shown in Table 1, a base material/adhesive layer 2B (layer B)/adhesive layer 2A is obtained in the same manner as in Example 1. (A layer) consists of an adhesive sheet.

<例3> 於包含聚合物P2(包含丙烯酸正丁酯(BA)/丙烯酸乙酯(EA)/AA=50/50/5(重量比)單體成分之丙烯酸系聚合物。SP值19.6)100份之甲苯溶液中加入環氧系交聯劑(三菱瓦斯化學公司製造,商品名「Tetrad C」)5份、稀釋用之甲苯(合計100份之量)進行混合,製備黏著劑組合物3a。將該黏著劑組合物3a塗佈於上述剝離膜R1之剝離處理面並進行乾燥,在該剝離膜R1上形成黏著劑層3A(厚度L1=5 μm)。 除將環氧系交聯劑5份變更成異氰酸酯系交聯劑(東曹公司製造,商品名「Coronate L」)3份以外,以與黏著劑組合物3a之製備相同之方式製備黏著劑組合物3b。將該黏著劑組合物3b塗佈於作為基材之PET膜(東麗公司製造,商品名「Lumirror S10」,厚度38 μm)之單面並進行乾燥,藉此在上述基材之單面上形成黏著劑層3B(厚度L2=35 μm)。 將形成於上述剝離膜R1上之黏著劑層3A之黏著面貼合於上述黏著劑層3B之黏著面,藉此獲得具有基材/黏著劑層3B(B層)/黏著劑層3A(A層)之構成之黏著片材。 <Example 3> 100 parts of toluene containing polymer P2 (acrylic polymer containing n-butyl acrylate (BA)/ethyl acrylate (EA)/AA=50/50/5 (weight ratio) monomer components. SP value 19.6) 5 parts of an epoxy cross-linking agent (manufactured by Mitsubishi Gas Chemical Co., Ltd., trade name "Tetrad C") and toluene for dilution (a total of 100 parts) were added to the solution and mixed to prepare an adhesive composition 3a. The adhesive composition 3a is applied to the release-treated surface of the release film R1 and dried to form an adhesive layer 3A (thickness L1 = 5 μm) on the release film R1. An adhesive composition was prepared in the same manner as the adhesive composition 3a except that 5 parts of the epoxy cross-linking agent was changed to 3 parts of an isocyanate cross-linking agent (manufactured by Tosoh Corporation, trade name "Coronate L") Thing 3b. The adhesive composition 3b was applied to one side of a PET film (manufactured by Toray Corporation, trade name "Lumirror S10", thickness 38 μm) as a base material and dried, thereby forming an adhesive composition 3b on one side of the base material. Adhesive layer 3B (thickness L2 = 35 μm) is formed. The adhesive surface of the adhesive layer 3A formed on the above-mentioned release film R1 is bonded to the adhesive surface of the above-mentioned adhesive layer 3B, thereby obtaining a base material/adhesive layer 3B (B layer)/adhesive layer 3A (A Adhesive sheet composed of layers).

<例4> 除將A層及B層之厚度設為如表1所示以外,以與例3相同之方式獲得具有基材/黏著劑層4B(B層)/黏著劑層4A(A層)之構成之黏著片材。 <Example 4> Except that the thicknesses of the A layer and the B layer are as shown in Table 1, a composition having the base material/adhesive layer 4B (B layer)/adhesive layer 4A (A layer) was obtained in the same manner as in Example 3. Adhesive sheet.

<例5> 於包含聚合物P3(包含EA/2EHA/甲基丙烯酸甲酯(MMA)/丙烯酸2-羥基乙酯(HEA)=30/70/5/4(重量比)之單體成分之丙烯酸系聚合物。SP值20.7)100份之甲苯溶液中加入熱膨脹性微小球(松本油脂製藥公司製造,商品名「Matsumoto Microsphere F-190D」)30份、異氰酸酯系交聯劑(東曹公司製造,商品名「Coronate L」)1.4份、黏著賦予劑(Yasuhara Chemical公司製造,商品名「MightyAce G125」)10份、稀釋用之甲苯(合計100份之量)進行混合,製備黏著劑組合物5c。將該黏著劑組合物5c塗佈於上述剝離膜R1之剝離處理面並進行乾燥,藉此在該剝離膜R1上形成黏著劑層5C(厚度45 μm)。 將形成於上述剝離膜R1上之黏著劑層5C之黏著面貼合於例4之黏著片材之基材背面,藉此獲得具有黏著劑層5C(第2黏著劑層)/基材/黏著劑層4B(B層)/黏著劑層4A(A層)之構成之雙面黏著片材。 <Example 5> Acrylic polymer containing monomer components of polymer P3 (containing EA/2EHA/methyl methacrylate (MMA)/2-hydroxyethyl acrylate (HEA)=30/70/5/4 (weight ratio) .SP value 20.7) Add 30 parts of thermally expandable microspheres (manufactured by Matsumoto Oil & Fat Pharmaceuticals Co., Ltd., trade name "Matsumoto Microsphere F-190D") and isocyanate cross-linking agent (manufactured by Tosoh Corporation, trade name " Coronate L") 1.4 parts, 10 parts of an adhesive imparting agent (manufactured by Yasuhara Chemical Co., Ltd., trade name "MightyAce G125"), and toluene for dilution (a total of 100 parts) were mixed to prepare an adhesive composition 5c. The adhesive composition 5c is applied to the release-treated surface of the release film R1 and dried, thereby forming an adhesive layer 5C (thickness 45 μm) on the release film R1. The adhesive surface of the adhesive layer 5C formed on the above-mentioned release film R1 was bonded to the back of the base material of the adhesive sheet of Example 4, thereby obtaining an adhesive layer 5C (second adhesive layer)/base material/adhesion A double-sided adhesive sheet composed of agent layer 4B (layer B)/adhesive layer 4A (layer A).

<例6> 於包含聚合物P3 100份之甲苯溶液中加入異氰酸酯系交聯劑(東曹公司製造,商品名「Coronate L」)1.5份、黏著賦予劑(Yasuhara Chemical公司製造,商品名「MightyAce G125」)10份、稀釋用之甲苯(合計100份之量)進行混合,製備黏著劑組合物6a。將該黏著劑組合物6c塗佈於上述剝離膜R1之剝離處理面並進行乾燥,藉此在該剝離膜R1上形成黏著劑層6A(厚度30 μm)。 於包含聚合物P3 100份之甲苯溶液中加入異氰酸酯系交聯劑(東曹公司製造,商品名「Coronate L」)1份、稀釋用之甲苯(合計100份之量)進行混合,製備黏著劑組合物6b。將該黏著劑組合物6b塗佈於作為基材之PET膜(東麗公司製造,商品名「Lumirror S10」,厚度38 μm)之單面並進行乾燥,藉此在上述基材之單面上形成黏著劑層6B(厚度L2=20 μm)。 將形成於上述剝離膜R1上之黏著劑層6A之黏著面貼合於上述黏著劑層6B之黏著面,藉此獲得具有基材/黏著劑層6B(B層)/黏著劑層6A(A層)之構成之黏著片材。 <Example 6> To a toluene solution containing 100 parts of polymer P3, 1.5 parts of an isocyanate cross-linking agent (manufactured by Tosoh Corporation, trade name "Coronate L") and 10 parts of an adhesive imparting agent (manufactured by Yasuhara Chemical Co., Ltd., trade name "MightyAce G125") were added parts and toluene for dilution (100 parts in total) to prepare adhesive composition 6a. The adhesive composition 6c is applied to the release-treated surface of the release film R1 and dried, thereby forming an adhesive layer 6A (thickness: 30 μm) on the release film R1. To a toluene solution containing 100 parts of polymer P3, add 1 part of an isocyanate cross-linking agent (manufactured by Tosoh Corporation, trade name "Coronate L") and toluene for dilution (100 parts in total) and mix to prepare an adhesive. Composition 6b. The adhesive composition 6b was applied to one side of a PET film (manufactured by Toray Corporation, trade name "Lumirror S10", thickness 38 μm) as a base material and dried, thereby forming a layer of adhesive composition 6b on one side of the base material. Adhesive layer 6B (thickness L2 = 20 μm) is formed. The adhesive surface of the adhesive layer 6A formed on the release film R1 is bonded to the adhesive surface of the adhesive layer 6B, thereby obtaining a base material/adhesive layer 6B (B layer)/adhesive layer 6A (A Adhesive sheet composed of layers).

<例7> 於包含聚合物P4(藉由相對於上述HEA22莫耳為11莫耳之甲基丙烯酸2-異氰酸乙酯(Karenz MOI:昭和電工公司製造)對包含2EHA/丙烯醯𠰌啉(ACMO)/HEA=75/25/22(莫耳比)之單體成分之丙烯酸系聚合物進行改性所獲得之丙烯酸系聚合物)100份之甲苯溶液中加入異氰酸酯系交聯劑(東曹公司製造,商品名「Coronate L」)5份、UV硬化性低聚物(東亞合成公司製造,商品名「Aronix M321」)10份、光起始劑(IGM Resins公司製造,商品名「Omnirad651」)3份、及稀釋用之乙酸乙酯進行混合,製備黏著劑組合物7a。將該黏著劑組合物7a塗佈於剝離膜R1之剝離處理面並進行乾燥,藉此在上述剝離膜R1上形成黏著劑層7A(厚度L1=5 μm)。 於包含聚合物P2 100份之甲苯溶液中加入異氰酸酯系交聯劑(東曹公司製造,商品名「Coronate L」)1份、UV硬化性低聚物(東亞合成公司製造,商品名「Aronix M321」)10份、光起始劑(IGM Resins公司製造,商品名「Omnirad651」)3份、及稀釋用之乙酸乙酯進行混合,製備黏著劑組合物7b。將該黏著劑組合物7b塗佈於作為基材之PET膜(東麗公司製造,商品名「Lumirror S10」,厚度38 μm)之單面並進行乾燥,藉此在上述基材之單面上形成黏著劑層7B(厚度L2=150 μm)。 將形成於上述剝離膜R1上之黏著劑層7A之黏著面貼合於上述黏著劑層7B之黏著面,藉此獲得具有基材/黏著劑層7B(B層)/黏著劑層7A(A層)之構成之黏著片材。 <Example 7> Polymer P4 containing 2EHA/acrylamide (ACMO)/ An acrylic polymer obtained by modifying an acrylic polymer with a monomer component of HEA = 75/25/22 (mol ratio) is added to 100 parts of a toluene solution and an isocyanate cross-linking agent (manufactured by Tosoh Corporation, Trade name "Coronate L") 5 parts, UV curable oligomer (manufactured by Toagosei Co., Ltd., trade name "Aronix M321") 10 parts, photoinitiator (manufactured by IGM Resins Co., Ltd., trade name "Omnirad 651") 3 parts , and ethyl acetate for dilution are mixed to prepare adhesive composition 7a. The adhesive composition 7a is applied to the release-treated surface of the release film R1 and dried, thereby forming an adhesive layer 7A (thickness L1 = 5 μm) on the release film R1. To a toluene solution containing 100 parts of polymer P2, add 1 part of an isocyanate cross-linking agent (manufactured by Tosoh Corporation, trade name "Coronate L") and UV curable oligomer (manufactured by Toa Gosei Co., Ltd., trade name "Aronix M321" "), 3 parts of photoinitiator (manufactured by IGM Resins, trade name "Omnirad 651"), and ethyl acetate for dilution were mixed to prepare adhesive composition 7b. The adhesive composition 7b was applied to one side of a PET film (manufactured by Toray Corporation, trade name "Lumirror S10", thickness 38 μm) as a base material and dried, whereby the adhesive composition 7b was applied to one side of the base material. Adhesive layer 7B (thickness L2 = 150 μm) is formed. The adhesive surface of the adhesive layer 7A formed on the release film R1 is bonded to the adhesive surface of the adhesive layer 7B, thereby obtaining a base material/adhesive layer 7B (B layer)/adhesive layer 7A (A Adhesive sheet composed of layers).

藉由上述方法來評價所獲得之黏著片材。將結果示於表1。再者,於加熱後抓固力之測定中,剝離均在上述丙烯酸系膠帶與測定對象之黏著面之界面進行,未觀察到與基材(PET膜)之間之抓固破壞。The obtained adhesive sheet was evaluated by the above method. The results are shown in Table 1. Furthermore, in the measurement of grip strength after heating, peeling was performed at the interface between the acrylic tape and the adhesive surface of the measurement object, and no grip damage was observed with the base material (PET film).

[表1] 表1 1 2 3 4 5 6 7 第1黏著劑層 A層 [份] 聚合物 P1 100 100 - - - - - P2 - - 100 100 100    - P3 - - - - - 100 - P4 - - - - - - 100 異氰酸酯系交聯劑 - - - - - 1.5 4.5 環氧系交聯劑 5 10 5 5 5 - - 黏著賦予劑 - - - - - 10 - UV硬化性低聚物 - - - - - - 10 光起始劑 - - - - - - 3 A層之厚度L1[μm] 10 5 5 6 6 30 5 B層 [份] 聚合物 P1 100 100 - - - - - P2 - - 100 100 100 - 100 P3 - - - - - 100 - 異氰酸酯系交聯劑 3 3 3 3 3 1 1 UV硬化性低聚物 - - - - - - 10 光起始劑 - - - - - - 3 B層之厚度L2[μm] 10 5 35 10 10 20 150 厚度比(L2/L1) 1.0 1.0 7.0 1.7 1.7 0.7 30.0 合計厚度(L1+L2)[μm] 20 10 40 16 16 50 155 基材厚度[μm] 38 38 38 38 38 38 38 第2黏著劑層之厚度[μm] - - - - 45 - - 評價 壓痕硬度 H1[MPa] 0.161 0.204 0.224 0.224 0.224 0.050 0.098 H2[MPa] 0.074 0.074 0.046 0.046 0.046 0.037 0.010 比(H2/H1) 0.46 0.36 0.20 0.20 0.20 0.74 0.10 拉絲性 D1[nm] 124 106 135 135 135 1550 1105 D2[nm] 796 796 534 534 534 18600 3771 比(D2/D1) 6.42 7.51 3.96 3.96 3.96 12.00 3.41 膨潤試驗 初始厚度T0[μm] 20 10 40 16 16 50 51 膨潤後厚度T1[μm] 29 16 52 24 24 75 71 厚度變化量[μm] 9 6 12 8 8 25 20 厚度變化率[%] 45% 60% 30% 50% 50% 50% 39% TMA沉入量[μm] 4.20 4.00 9.80 4.80 4.80 8.60 10.70 弛豫時間T 2s A層[μsec] 28 22 26 26 26 52 48 B層[μsec] 56 56 53 53 53 55 61 對於PET之黏著力[N/20 mm] 0.30 0.20 0.85 0.54 0.54 5.40 7.15 加熱後抓固力[N/20 mm] 5.80 5.50 6.10 6.20 6.20 9.40 17.75 對於密封樹脂之黏著力[N/20 mm] 1.60 1.50 2.50 2.10 2.10 10.20 11.50 糊劑殘留性評價 G G G G G P P 模型溢料評價 G G G G G G G 間隙評價 G G G G G P P [Table 1] Table 1 example 1 2 3 4 5 6 7 1st adhesive layer A layer [share] polymer P1 100 100 - - - - - P2 - - 100 100 100 - P3 - - - - - 100 - P4 - - - - - - 100 Isocyanate cross-linking agent - - - - - 1.5 4.5 Epoxy cross-linking agent 5 10 5 5 5 - - Adhesion imparting agent - - - - - 10 - UV curable oligomer - - - - - - 10 photoinitiator - - - - - - 3 Thickness L1 of layer A [μm] 10 5 5 6 6 30 5 B layer [share] polymer P1 100 100 - - - - - P2 - - 100 100 100 - 100 P3 - - - - - 100 - Isocyanate cross-linking agent 3 3 3 3 3 1 1 UV curable oligomer - - - - - - 10 photoinitiator - - - - - - 3 Thickness L2 of layer B [μm] 10 5 35 10 10 20 150 Thickness ratio (L2/L1) 1.0 1.0 7.0 1.7 1.7 0.7 30.0 Total thickness (L1+L2)[μm] 20 10 40 16 16 50 155 Substrate thickness [μm] 38 38 38 38 38 38 38 Thickness of the second adhesive layer [μm] - - - - 45 - - Evaluation Indentation hardness H1[MPa] 0.161 0.204 0.224 0.224 0.224 0.050 0.098 H2[MPa] 0.074 0.074 0.046 0.046 0.046 0.037 0.010 Ratio(H2/H1) 0.46 0.36 0.20 0.20 0.20 0.74 0.10 Drawnability D1[nm] 124 106 135 135 135 1550 1105 D2[nm] 796 796 534 534 534 18600 3771 Ratio (D2/D1) 6.42 7.51 3.96 3.96 3.96 12.00 3.41 Swelling test Initial thickness T0[μm] 20 10 40 16 16 50 51 Thickness after swelling T1[μm] 29 16 52 twenty four twenty four 75 71 Thickness variation [μm] 9 6 12 8 8 25 20 Thickness change rate [%] 45% 60% 30% 50% 50% 50% 39% TMA sinking amount [μm] 4.20 4.00 9.80 4.80 4.80 8.60 10.70 Relaxation time T 2s A layer [μsec] 28 twenty two 26 26 26 52 48 B layer [μsec] 56 56 53 53 53 55 61 Adhesion to PET [N/20 mm] 0.30 0.20 0.85 0.54 0.54 5.40 7.15 Grip strength after heating [N/20 mm] 5.80 5.50 6.10 6.20 6.20 9.40 17.75 Adhesion to sealing resin [N/20 mm] 1.60 1.50 2.50 2.10 2.10 10.20 11.50 Paste residue evaluation G G G G G P P Model spillage evaluation G G G G G G G Gap evaluation G G G G G P P

如表1所示,於壓痕硬度H1為0.10 MPa以上0.50 MPa以下,且壓痕硬度H2為0.001 MPa以上0.090 MPa以下之例1~5之黏著片材中,模型溢料防止性良好,糊劑殘留防止性亦良好。As shown in Table 1, in the adhesive sheets of Examples 1 to 5 in which the indentation hardness H1 is 0.10 MPa or more and 0.50 MPa or less, and the indentation hardness H2 is 0.001 MPa or more and 0.090 MPa or less, the model flash prevention is good and the paste is The prevention of agent residue is also good.

以上,雖詳細說明本發明之具體例,但該等僅為例示,並未限定申請專利範圍。申請專利範圍所記載之技術中包含有將以上所例示之具體例進行各種變形、變更所得者。Although specific examples of the present invention have been described in detail above, these are only examples and do not limit the scope of the patent application. The technology described in the scope of the patent application includes various modifications and changes of the specific examples illustrated above.

1:半導體晶片 2:密封樹脂 2':半硬化物 10:基材(基材膜) 20:黏著劑層(第1黏著劑層) 22:A層 24:B層 30:第2黏著劑層 50:構造體 100:黏著片材 200:黏著片材 300:黏著片材 A:測定位置A B:測定位置B 1:Semiconductor wafer 2:Sealing resin 2': semi-hardened material 10: Substrate (substrate film) 20: Adhesive layer (1st adhesive layer) 22:A layer 24:B floor 30: 2nd adhesive layer 50:Construction 100:Adhesive sheet 200:Adhesive sheet 300: Adhesive sheet A: Measurement position A B: Measurement position B

圖1係模式性地表示一實施方式之黏著片材之構成之截面圖。 圖2之(i)~(iv)係表示使用圖1所示之黏著片材所進行之半導體晶片樹脂密封步驟之一例之說明圖。 圖3係模式性地表示另一實施方式之黏著片材之構成之截面圖。 圖4係模式性地表示另一實施方式之黏著片材之構成之截面圖。 圖5係用於說明拉絲性之定義之模式圖。 FIG. 1 is a cross-sectional view schematically showing the structure of an adhesive sheet according to one embodiment. FIGS. 2(i) to 2(iv) are explanatory diagrams showing an example of resin sealing steps for a semiconductor chip using the adhesive sheet shown in FIG. 1 . FIG. 3 is a cross-sectional view schematically showing the structure of an adhesive sheet according to another embodiment. FIG. 4 is a cross-sectional view schematically showing the structure of an adhesive sheet according to another embodiment. Figure 5 is a schematic diagram for explaining the definition of drawability.

10:基材(基材膜) 10: Substrate (substrate film)

20:黏著劑層(第1黏著劑層) 20: Adhesive layer (1st adhesive layer)

100:黏著片材 100:Adhesive sheet

A:測定位置A A: Measurement position A

B:測定位置B B: Measurement position B

Claims (19)

一種黏著片材,其係具備基材、及配置於該基材之至少單側之黏著劑層者, 於利用奈米壓痕儀所進行之壓痕硬度測定中,上述黏著劑層之表面之壓痕硬度H1為0.10 MPa以上0.50 MPa以下,且於上述黏著片材之截面中在自上述基材向上述黏著劑層之表面側距離4 μm之位置處所測得之壓痕硬度H2為0.001 MPa以上0.090 MPa以下。 An adhesive sheet having a base material and an adhesive layer disposed on at least one side of the base material, In the indentation hardness measurement using a nanoindentation instrument, the indentation hardness H1 of the surface of the above-mentioned adhesive layer is 0.10 MPa or more and 0.50 MPa or less, and in the cross-section of the above-mentioned adhesive sheet from the above-mentioned base material to The indentation hardness H2 measured at a distance of 4 μm from the surface side of the above-mentioned adhesive layer is 0.001 MPa or more and 0.090 MPa or less. 如請求項1之黏著片材,其中上述壓痕硬度H2[MPa]相對於上述壓痕硬度H1[MPa]之比(H2/H1)為0.002以上0.90以下。The adhesive sheet according to claim 1, wherein the ratio (H2/H1) of the above-mentioned indentation hardness H2 [MPa] to the above-mentioned indentation hardness H1 [MPa] is 0.002 or more and 0.90 or less. 如請求項1或2之黏著片材,其中於利用奈米壓痕儀所進行之拉絲性評價中,上述黏著劑層之表面之拉絲性D1為50 nm以上500 nm以下,且於上述黏著片材之截面中在自上述基材向上述黏著劑層之表面側距離4 μm之位置處所測得之拉絲性D2為150 nm以上1000 nm以下。The adhesive sheet of claim 1 or 2, wherein in the stringability evaluation using a nanoindentation instrument, the stringiness D1 of the surface of the adhesive layer is 50 nm or more and 500 nm or less, and in the above-mentioned adhesive sheet The drawability D2 measured at a distance of 4 μm from the base material to the surface side of the adhesive layer in the cross section of the material is 150 nm or more and 1000 nm or less. 如請求項3之黏著片材,其中上述拉絲性D2[nm]相對於上述拉絲性D1[nm]之比(D2/D1)為0.3以上20.0以下。The adhesive sheet according to claim 3, wherein the ratio (D2/D1) of the above-mentioned stringiness D2 [nm] to the above-mentioned stringiness D1 [nm] (D2/D1) is 0.3 or more and 20.0 or less. 如請求項1至4中任一項之黏著片材,其中將4-第三丁基苯基縮水甘油醚滴下至上述黏著劑層之表面並靜置1分鐘後,該黏著劑層之厚度T1[μm]與該黏著劑層之初始厚度T0[μm]之差(T1-T0)為20 μm以下。The adhesive sheet according to any one of claims 1 to 4, wherein 4-tert-butylphenyl glycidyl ether is dropped onto the surface of the above-mentioned adhesive layer and left to stand for 1 minute, the thickness of the adhesive layer is T1 The difference (T1-T0) between [μm] and the initial thickness T0 [μm] of the adhesive layer is 20 μm or less. 如請求項1至5中任一項之黏著片材,其中使用熱機械分析裝置,在測定環境溫度23℃、壓入負載0.01 N、壓入負荷時間60分鐘之條件下所測得之針入探針自上述黏著劑層表面之沉入量為3.50 μm以上20.0 μm以下。For example, the adhesive sheet according to any one of claims 1 to 5, wherein a thermomechanical analysis device is used to measure the needle penetration measured under the conditions of an ambient temperature of 23°C, a press-in load of 0.01 N, and a press-in load time of 60 minutes. The sinking amount of the probe from the surface of the above-mentioned adhesive layer is 3.50 μm or more and 20.0 μm or less. 如請求項1至6中任一項之黏著片材,其中上述黏著劑層之厚度為5 μm以上110 μm以下。The adhesive sheet according to any one of claims 1 to 6, wherein the thickness of the adhesive layer is 5 μm or more and 110 μm or less. 如請求項1至7中任一項之黏著片材,其中上述基材係包含玻璃轉移溫度為25℃以上之樹脂材料之基材膜。The adhesive sheet according to any one of claims 1 to 7, wherein the base material is a base film containing a resin material with a glass transition temperature of 25°C or above. 如請求項1至8中任一項之黏著片材,其對於聚對苯二甲酸乙二酯膜之黏著力為0.05 N/20 mm以上1.00 N/20 mm以下。For example, the adhesive sheet according to any one of claims 1 to 8 has an adhesive force to the polyethylene terephthalate film of 0.05 N/20 mm or more and 1.00 N/20 mm or less. 如請求項1至9中任一項之黏著片材,其中於150℃下對上述黏著片材加熱1小時後,於23℃下測得之上述黏著劑層對於上述基材之抓固力為4.00 N/20 mm以上。The adhesive sheet according to any one of claims 1 to 9, wherein after heating the adhesive sheet at 150°C for 1 hour, the gripping force of the adhesive layer on the base material measured at 23°C is 4.00 N/20 mm or more. 如請求項1至10中任一項之黏著片材,其中構成上述黏著劑層之至少表面之黏著劑係將丙烯酸系聚合物作為基礎聚合物之丙烯酸系黏著劑。The adhesive sheet according to any one of claims 1 to 10, wherein the adhesive constituting at least the surface of the adhesive layer is an acrylic adhesive using an acrylic polymer as a base polymer. 如請求項11之黏著片材,其中上述丙烯酸系聚合物之SP值為18.0~20.0。The adhesive sheet of claim 11, wherein the SP value of the acrylic polymer is 18.0 to 20.0. 如請求項1至12中任一項之黏著片材,其中上述黏著劑層包含:構成該黏著劑層之表面之A層、及配置於上述A層與上述基材之間且與該基材鄰接之B層。The adhesive sheet according to any one of claims 1 to 12, wherein the adhesive layer includes: an A layer constituting the surface of the adhesive layer, and an A layer disposed between the A layer and the base material and with the base material The adjacent B floor. 如請求項13之黏著片材,其中上述A層之厚度L1為1 μm以上10 μm以下。Such as the adhesive sheet of claim 13, wherein the thickness L1 of the above-mentioned layer A is 1 μm or more and 10 μm or less. 如請求項13或14之黏著片材,其中上述B層之厚度L2為4 μm以上100 μm以下。For example, the adhesive sheet of claim 13 or 14, wherein the thickness L2 of the above-mentioned layer B is 4 μm or more and 100 μm or less. 如請求項13至15中任一項之黏著片材,其中上述B層之厚度L2[μm]相對於上述A層之厚度L1[μm]之比(L2/L1)為1.0~100.0。The adhesive sheet according to any one of claims 13 to 15, wherein the ratio (L2/L1) of the thickness L2 [μm] of the above-mentioned layer B to the thickness L1 [μm] of the above-mentioned layer A (L2/L1) is 1.0 to 100.0. 如請求項13至16中任一項之黏著片材,其中上述A層之利用脈衝NMR所得之S成分之T 2弛豫時間(T 2s)為45 μsec以下,上述B層之利用脈衝NMR所得之S成分之T 2弛豫時間(T 2s)比45 μsec長。 The adhesive sheet according to any one of claims 13 to 16, wherein the T 2 relaxation time (T 2s ) of the S component of the above-mentioned layer A obtained by pulse NMR is 45 μsec or less, and the T 2 relaxation time (T 2s ) of the above-mentioned B layer obtained by pulse NMR The T 2 relaxation time (T 2s ) of the S component is longer than 45 μsec. 如請求項13至17中任一項之黏著片材,其中上述A層藉由環氧系交聯劑交聯,上述B層藉由異氰酸酯系交聯劑交聯。The adhesive sheet according to any one of claims 13 to 17, wherein the above-mentioned layer A is cross-linked by an epoxy-based cross-linking agent, and the above-mentioned layer B is cross-linked by an isocyanate-based cross-linking agent. 如請求項1至18中任一項之黏著片材,其具備:上述基材、配置於上述基材之單側之上述黏著劑層、及配置於上述基材之與上述黏著劑層相反一側之第2黏著劑層,且 上述第2黏著劑層之至少表面包含含有熱膨脹性微小球之黏著劑。 The adhesive sheet according to any one of claims 1 to 18, which includes: the above-mentioned base material, the above-mentioned adhesive layer arranged on one side of the above-mentioned base material, and an opposite side of the above-mentioned adhesive layer arranged on the above-mentioned base material. The second adhesive layer on the side, and At least the surface of the second adhesive layer includes an adhesive containing thermally expandable microspheres.
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