TW202316110A - Detecting test piece and electrode manufacturing method - Google Patents
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本發明是有關於一種電極的製造技術,尤其是一種電極製造方法,以及包含該電極的檢測試片。The invention relates to an electrode manufacturing technology, in particular to an electrode manufacturing method, and a test piece containing the electrode.
血糖(英語:Blood sugar)是指血液中的葡萄糖,消化食物中的葡萄糖,會由小腸進入血液,以運輸到身體中的各個細胞,是細胞的主要能量來源。Blood sugar (English: Blood sugar) refers to the glucose in the blood. The glucose in the digested food will enter the blood from the small intestine and be transported to various cells in the body. It is the main energy source of the cells.
在人體中,血液中的血糖濃度是被嚴格控制的,空腹血糖值的正常值為60mg/dL~99mg/dL,若空腹血糖值超過126mg/dL則為糖尿病,飯後血糖值的正常值為60mg/dL~139mg/dL,若飯後血糖值超過 200mg/dL則為糖尿病。In the human body, the blood sugar concentration in the blood is strictly controlled. The normal value of fasting blood sugar is 60mg/dL~99mg/dL. If the fasting blood sugar exceeds 126mg/dL, it is diabetes. 60mg/dL~139mg/dL, if the blood sugar value after meal exceeds 200mg/dL, it is diabetes.
血液中的血糖濃度失調會導致多種疾病,如持續血糖濃度過高的高血糖,以及血糖濃度過低的低血糖,而由多種原因導致的持續性高血糖就會引發糖尿病,這也是與血糖濃度最相關的疾病,而低血糖則會出現頭暈、注意力不能集中,甚至出現休克等症狀。The imbalance of blood sugar concentration in the blood can lead to various diseases, such as hyperglycemia in which the blood sugar concentration is too high, and hypoglycemia in which the blood sugar concentration is too low, and persistent hyperglycemia caused by various reasons will lead to diabetes, which is also related to blood sugar concentration. The most relevant diseases, while hypoglycemia will cause dizziness, inability to concentrate, and even shock and other symptoms.
為了使有血糖相關症狀的患者可以隨時量測血糖,市售的血糖量測試片可以提供血糖相關症狀的患者可以隨時隨地量測血糖,當血糖出現異常值時,可以快速進行血糖的控制,以避免過高或過低的血糖造成人體的傷害。In order to enable patients with blood sugar-related symptoms to measure blood sugar at any time, commercially available blood sugar test tablets can provide patients with blood sugar-related symptoms to measure blood sugar anytime and anywhere. Avoid damage to the human body caused by high or low blood sugar.
一般的血糖量測試片上會設置一層導電層,以提供血糖量測機進行電性的量測,目前導電層的製造方法有網版印刷、濺鍍、蒸鍍...等等的技術,其中,網版印刷的製造成本較低,被廣泛使用在檢測試片上的電極製造。Generally, a conductive layer is provided on the blood glucose test sheet to provide electrical measurement for the blood glucose measuring machine. The current manufacturing methods of the conductive layer include screen printing, sputtering, evaporation, etc., among which , The manufacturing cost of screen printing is low, and it is widely used in the manufacture of electrodes on the detection test piece.
但是網版印刷所製造的電極結構無法細緻,電極結構的寬度會大於75μm,而且電極結構的側邊會產生毛邊或不規則的形狀,如此將會造成複數電極結構的間距有大有小,將會影響檢測試片的電性檢測。However, the electrode structure produced by screen printing cannot be detailed, the width of the electrode structure will be greater than 75 μm, and the sides of the electrode structure will have burrs or irregular shapes, which will cause the spacing of multiple electrode structures to be large or small. Affect the electrical detection of the test piece.
由上述說明可知,目前的檢測試片具有下列缺點:As can be seen from the above description, the current detection test strip has the following disadvantages:
一、成本過高:1. The cost is too high:
將導電材料塗覆在裸片後,再以刻除的方式製作出全部的電極圖案,會耗費較高的製造成本。After the conductive material is coated on the bare chip, all the electrode patterns are produced by etching, which will consume a relatively high manufacturing cost.
二、檢測區的面積過大:2. The area of the detection area is too large:
單以網版印刷雖然可以取得製造成本較低的檢測試片,但是所製造出的電極結構無法細緻化,在電極結構寬度過大,或是複數電極間距過大的條件下,會造成檢測區的面積過大。Although screen printing alone can obtain test pieces with low manufacturing costs, the electrode structure produced cannot be refined. If the width of the electrode structure is too large, or the distance between multiple electrodes is too large, the area of the detection area will be reduced. is too big.
三、反應物配置不均勻:3. Uneven distribution of reactants:
續上所述,由於反應區的面積過大,不僅會造成該反應區中使用的反應物太多,加上設置於該反應區中的電極結構也無法細緻,當反應物塗覆在該反應區時,更會產生反應物塗覆層不均勻的狀況。Continuing from the above, because the area of the reaction zone is too large, not only will there be too many reactants used in the reaction zone, but also the electrode structure arranged in the reaction zone will not be fine. When the reactant is coated on the reaction zone When, more can produce the situation of reactant coating layer inhomogeneity.
因此,如何在最佳的成本製造出較為細緻的電極結構,以進一步縮小反應區的面積,藉此減少反應物的用量,並且以均勻的方式將反應物塗覆在該反應區,是相關技術人員亟需努力的目標。Therefore, how to manufacture a relatively detailed electrode structure at the best cost to further reduce the area of the reaction zone, thereby reducing the amount of reactants and coating the reactants in the reaction zone in a uniform manner, is a related technology. A goal that people desperately need to work on.
有鑑於此,本發明之目的是在提供一種電極製造方法,包含一導線塗覆步驟、一區域塗覆步驟,及一材料刻除步驟。In view of this, the object of the present invention is to provide an electrode manufacturing method, which includes a wire coating step, an area coating step, and a material removal step.
於該導線塗覆步驟中,使用一第一網版將導電材料塗覆於一裸片的表面,該第一網版上具有至少一電路圖案,以使導電材料於該裸片的表面形成複數傳輸電路。In the wire coating step, a first screen is used to coat the surface of a bare chip with conductive material, and the first screen has at least one circuit pattern, so that the conductive material forms a plurality of layers on the surface of the bare chip. transmission circuit.
於該區域塗覆步驟中,使用一第二網版將導電材料塗覆於該裸片的表面,該第二網版上具有至少一區域圖案,以使導電材料於該裸片的表面形成一備刻區域,該備刻區域與該複數傳輸電路的一端連接。In the area coating step, a second screen is used to coat the surface of the bare chip with conductive material, the second screen has at least one area pattern, so that the conductive material forms a surface on the surface of the die. The marking preparation area is connected to one end of the multiple transmission circuit.
於該材料刻除步驟中,移除該備刻區域中的部分導電材料,以使該備刻區域中的導電材料在該複數傳輸電路的一端形成複數檢測電極。In the material removal step, part of the conductive material in the preparation area is removed, so that the conductive material in the preparation area forms a plurality of detection electrodes at one end of the plurality of transmission circuits.
本發明的又一技術手段,是在於上述之材料刻除步驟中,移除該備刻區域中的部分導電材料的方法是選自於雷射刻除、化學蝕刻、乾式蝕刻的其中之一技術。Another technical means of the present invention is that in the above-mentioned material etching step, the method of removing part of the conductive material in the preparation area is selected from one of laser etching, chemical etching, and dry etching. .
本發明的另一技術手段,是在於上述之電極製造方法更包含一於該區域塗覆步驟之前的異物清潔步驟,去除該裸片表面上的異物。Another technical means of the present invention is that the above-mentioned electrode manufacturing method further includes a foreign matter cleaning step before the region coating step, to remove foreign matter on the surface of the die.
本發明的再一技術手段,是在於上述之異物清潔步驟中,是使用滾輪清潔的技術或空氣吹除的技術去除該裸片表面上的異物。Another technical means of the present invention is that in the above-mentioned foreign matter cleaning step, the foreign matter on the surface of the bare chip is removed by using a roller cleaning technique or an air blowing technique.
本發明的另一技術手段,是在於上述之該裸片表面的導電材料為碳。Another technical means of the present invention lies in that the conductive material on the surface of the bare chip is carbon.
本發明的又一技術手段,是在於上述之導線塗覆步驟中,更包括下列子步驟:Another technical means of the present invention lies in the above-mentioned wire coating step, further comprising the following sub-steps:
一第一底層塗覆步驟,將銀塗覆於該裸片的表面;及a first primer coating step, coating the surface of the die with silver; and
一第一頂層塗覆步驟,將碳塗覆在銀的表面。A first top coating step applies carbon to the surface of the silver.
本發明的另一技術手段,是在於上述之區域塗覆步驟中,更包括下列子步驟:Another technical means of the present invention lies in the above-mentioned area coating step, further comprising the following sub-steps:
一第二底層塗覆步驟,將銀塗覆於該裸片的表面;及a second primer coating step, coating the surface of the die with silver; and
一第二頂層塗覆步驟,將碳塗覆在銀的表面。A second top coating step applies carbon to the surface of the silver.
本發明的再一技術手段,是在於上述之區域塗覆步驟中,塗覆於該裸片表面的導電材料覆蓋住該複數傳輸電路的一端。Another technical measure of the present invention is that in the above-mentioned area coating step, the conductive material coated on the surface of the bare chip covers one end of the plurality of transmission circuits.
本發明的又一技術手段,是在於上述之電極製造方法,更包含一於該材料刻除步驟之後的品管檢測步驟,於該導線塗覆步驟中,該複數傳輸電路的一端形成複數接觸電極,於該區域塗覆步驟中,該備刻區域與該複數接觸電極分設於該複數傳輸電路的兩端,於該品管檢測步驟中,於該複數檢測電極上塗覆品管液,以該複數接觸電極為檢測點,測量該複數傳輸電路、該複數檢測電極,及該品管液的電性,用以判斷該複數檢測電極是否合乎標準。Another technical means of the present invention lies in the above-mentioned electrode manufacturing method, which further includes a quality control inspection step after the material engraving step, and in the wire coating step, a plurality of contact electrodes are formed at one end of the plurality of transmission circuits , in the area coating step, the marking area and the plurality of contact electrodes are separately arranged at the two ends of the plurality of transmission circuits, and in the quality control detection step, the quality control liquid is coated on the plurality of detection electrodes, with the The plurality of contact electrodes are detection points, and the electrical properties of the plurality of transmission circuits, the plurality of detection electrodes, and the quality control liquid are measured to judge whether the plurality of detection electrodes meet the standards.
本發明的另一技術手段,是在於上述之材料刻除步驟中,該複數檢測電極平行設置且側邊形成鋸齒形狀,該複數檢測電極之相鄰的鋸齒側邊呈凸凹對應設置。Another technical means of the present invention is that in the above-mentioned material removal step, the plurality of detection electrodes are arranged in parallel and have a zigzag shape on their sides, and the adjacent zigzag sides of the plurality of detection electrodes are correspondingly arranged in convex and concave shapes.
本發明的另一目的是在提供一種電極製造方法,該電極製造方法包含一塗覆步驟,及一刻除步驟。Another object of the present invention is to provide an electrode manufacturing method, which includes a coating step and an ablation step.
於該塗覆步驟中,使用網版印刷將導電材料塗覆在一裸片的表面。In the coating step, conductive material is coated on the surface of a die using screen printing.
於該刻除步驟中,將部份位於該裸片表面的導電材料移除,以使存留在該裸片表面的導電材料形成複數傳輸電路,該複數傳輸電路彼此短路,每一傳輸電路的兩端分別為一檢測電極,及一接觸電極,該複數檢測電極彼此靠緊用以塗覆一反應層,該複數接觸電極彼此靠緊以供一血糖量測機偵測該反應層的電性。In the etching step, part of the conductive material on the surface of the bare chip is removed, so that the conductive material remaining on the surface of the bare chip forms a plurality of transmission circuits, and the plurality of transmission circuits are short-circuited with each other. The terminals are respectively a detection electrode and a contact electrode. The plurality of detection electrodes are close to each other for coating a reaction layer, and the plurality of contact electrodes are close to each other for a blood glucose measuring machine to detect the electrical properties of the reaction layer.
本發明的另一目的是在提供一種檢測試片,該檢測試片中的電極適用於上述之電極製造方法,該檢測試片包含一下底板、一導電層、一中隔板、一上層板,及一反應層。Another object of the present invention is to provide a test piece, the electrode in the test piece is suitable for the above-mentioned electrode manufacturing method, the test piece includes a bottom plate, a conductive layer, a middle partition, an upper plate, and a reaction layer.
該導電層設置於該下底板的表面,該導電層包括複數傳輸電路、複數設置於該複數傳輸電路一端之檢測電極,及複數設置於該複數傳輸電路另一端之接觸電極。The conductive layer is arranged on the surface of the lower base plate, and the conductive layer includes a plurality of transmission circuits, a plurality of detection electrodes arranged at one end of the plurality of transmission circuits, and a plurality of contact electrodes arranged at the other end of the plurality of transmission circuits.
該中隔板與該下底板貼附在一起,該複數傳輸電路被包覆於該中隔板,及該下底板之間,該複數檢測電極,及該複數接觸電極對外顯露。The middle partition and the lower bottom board are attached together, the plurality of transmission circuits are covered between the middle partition and the lower bottom board, and the plurality of detection electrodes and the plurality of contact electrodes are exposed to the outside.
該上層板包括一與該中隔板貼附在一起之貼附部,及一與該貼附部連接之延伸部,該延伸部與該下底板,及該複數檢測電極彼此間隔並界定出一容置空間。The upper plate includes an attached portion attached to the intermediate plate, and an extension portion connected to the attached portion, the extension portion is spaced from the lower base plate, and the plurality of detection electrodes and defines a Accommodate space.
該反應層設置於該容置空間中,該反應層貼附於該下底板上並包覆著該複數檢測電極。The reaction layer is arranged in the accommodating space, and the reaction layer is attached to the lower base plate and covers the plurality of detection electrodes.
本發明之有益功效在於,該導線塗覆步驟已使用網版印刷技術完成該複數傳輸電路,可以減少該材料刻除步驟中,移除該導電材料的面積,藉以減少製造的時間及成本,並於該材料刻除步驟中,縮小該複數接觸電極的尺寸及間距,藉此縮小檢測區的面積。The beneficial effect of the present invention is that the wire coating step has used screen printing technology to complete the complex transmission circuit, which can reduce the area of the conductive material removed in the material etching step, thereby reducing the time and cost of manufacturing, and In the material etching step, the size and spacing of the plurality of contact electrodes are reduced, thereby reducing the area of the detection region.
有關本發明之相關申請專利特色與技術內容,在以下配合參考圖式之四個較佳實施例的詳細說明中,將可清楚地呈現。在進行詳細說明前應注意的是,類似的元件是以相同的編號來做表示。The features and technical contents of the relevant patent applications of the present invention will be clearly presented in the following detailed descriptions of four preferred embodiments with reference to the drawings. Before proceeding with the detailed description, it should be noted that like elements are denoted by the same reference numerals.
參閱圖1為本發明一種電極製造方法之一第一較佳實施例,該電極製造方法包含一塗覆步驟81,及一刻除步驟82。Referring to FIG. 1 , it is a first preferred embodiment of an electrode manufacturing method according to the present invention. The electrode manufacturing method includes a
於該塗覆步驟81中,使用網版印刷將導電材料塗覆在一裸片的表面,較佳地,可以在B4大小的裸片表面塗覆上一層碳所形成的導電層,該導電層佈滿該裸片的表面,實際實施時,該裸片可以使用其他尺寸,並且經過兩次網版印刷,第一次網版印刷塗覆銀材料,第二次網版印刷塗覆碳材料,以形成底層為銀,頂層為碳的導電層,不應以此為限。In the
於該刻除步驟82,將部份位於該裸片表面的導電材料移除,以使存留在該裸片表面的導電材料形成複數傳輸電路,於該第一較佳實施例,導電材料的移除技術為雷射刻除技術,實際實施時,可使用其他移除技術,不應以此為限。該複數傳輸電路彼此短路,每一傳輸電路的兩端分別為一檢測電極,及一接觸電極,該複數檢測電極彼此靠緊,該複數接觸電極彼此靠緊。In the
請參閱圖2,為移除該裸片上的導電材料後所形成的圖案,其中,圖2中試片邊界22為裁切裸片後所形成之檢測試片的外觀,刻除線23為雷射的刻除區域,該試片邊界22圍繞的區域中所顯示的白色區域為存留在裸片上的導電材料。Please refer to Fig. 2, which is the pattern formed after removing the conductive material on the bare chip, wherein, the
由圖2可以瞭解,於該刻除步驟82後,存留在裸片上的導電材料會被該刻除線23區分成一第一傳輸電路61、一第二傳輸電路62、一第三傳輸電路63,及一第四傳輸電路64,該第一傳輸電路61的兩端分別為第一檢測電極611,及一第一接觸電極612,該第二傳輸電路62的兩端分別為第二檢測電極621,及一第二接觸電極622,該第三傳輸電路63的兩端分別為第三檢測電極631,及一第三接觸電極632,該第四傳輸電路64的兩端分別為第四檢測電極641,及一第四接觸電極642,該第一檢測電極611、該第二檢測電極621、該第三檢測電極631,及該第四檢測電極641位於檢測試片的頂端並彼此靠緊,該第一接觸電極612、該第二接觸電極622、該第三接觸電極632,及該第四接觸電極642位於檢測試片的底端並彼此靠緊。It can be understood from FIG. 2 that after the
請參閱圖3,於該刻除步驟82後會執行一反應層製造步驟,主要是在複數的檢測電極上塗覆一反應層65,於該第一較佳實施例,是於該第一檢測電極611、該第二檢測電極621,及該第三檢測電極631上塗覆反應物並形成一反應層65,該反應層65與該第一檢測電極611、該第二檢測電極621,及該第三檢測電極631電連接,該反應層65並未與該第四檢測電極641電連接,實際實施時,該反應層65的塗覆區域應以實際使用為主,不應以此為限。Please refer to FIG. 3 , a reaction layer manufacturing step will be performed after the
請參閱圖4,在完成該反應層製造步驟後可進入一黏貼裁切步驟,是於該裸片之具有導電材料的表面貼附一中層板,在該裸片上形成複數檢測區66,及複數接觸區67,接著在該中層板上貼附一上層板68並進行該裸片的裁切,以取得複數具有檢測區66,及接觸區67的檢測試片69,該檢測區66用以容置血液,該反應層65對容置的血液產生對應的電性反應,該接觸區67可供血糖量測機進行電性偵測,用以取的該反應層65的電性反應,藉以分析出容置於該檢測區66的血液特性。Please refer to Fig. 4, after completing the manufacturing step of the reaction layer, you can enter a sticking and cutting step, which is to attach a middle layer board on the surface of the bare chip with conductive material, and form a plurality of
參閱圖5、圖6,及圖7,為本發明一種檢測試片5之一第二較佳實施例,該檢測試片5包含一下底板51、一導電層52、一中隔板53、一上層板54,及一反應層56。Referring to Fig. 5, Fig. 6, and Fig. 7, it is a second preferred embodiment of a
該下底板51、該中隔板53,及該上層板54的材質均為薄薄的塑膠板,其形狀概呈長條形,該導電層52是以塗覆的方式設置於該下底板51的上表面,該導電層52的結構包括複數傳輸電路521、複數設置於該複數傳輸電路521一端之檢測電極522,及複數設置於該複數傳輸電路521另一端之接觸電極523,該複數檢測電極522及該複數接觸電極523分別設置於該下底板51的相對兩端,該下底板51的兩端分別界定出一檢測區57,及一接觸區58,該複數檢測電極522設置於該檢測區57中,該複數接觸電極523設置於該接觸區58中。The
該中隔板53的底面與該下底板51的頂面貼附在一起,該複數傳輸電路521被包覆於該中隔板53,及該下底板51之間,該中隔板53的平板面積略小於該下底板51的平板面積,以使該檢測區57,及該接觸區58對外顯露,並使該複數檢測電極522,及該複數接觸電極523對外顯露。The bottom surface of the
該上層板54包括一貼附部541,及一與該貼附部541連接之延伸部542,該貼附部541的底面與該中隔板53的頂面貼附在一起,該延伸部542的平板面積與該檢測區57的面積相配合,且該延伸部542的設置位置對應該檢測區57並彼此間隔,該延伸部542與該下底板51上的檢測區57,及該複數檢測電極522彼此間隔,並相配合界定出一容置空間55,而該下底板51上的接觸區58維持著對外顯露。The
該反應層56設置於該容置空間55中,該反應層56以塗覆的方式貼附於該下底板51上,並且該反應層56包覆著該複數檢測電極522,該容置空間55可供血液容置,該反應層56可對血液中的葡萄糖產生電性反應,該接觸區58上的複數接觸電極523可供血糖量測機進行電性接觸,藉此對該反應層56通電以偵測電性,最後轉換成血糖值並對外顯示,實際實施時,該反應層56可以使用其他的物質,用以對其他的液體進行量測,不應以此為限。The
請參閱圖8,為該第二較佳實施例中,該檢測試片5表面的電極製造方法,該電極製造方法包含一導線塗覆步驟91、一區域塗覆步驟92,及一材料刻除步驟93。Please refer to Fig. 8, for the second preferred embodiment, the electrode manufacturing method on the surface of the
於該導線塗覆步驟91中,使用一第一網版(圖式未示出)將導電材料塗覆於一裸片21的表面,該第一網版上具有至少一電路圖案,以使導電材料於該裸片21的表面形成複數傳輸電路31。In the
請參閱圖9,為該裸片21上塗覆導電材料後的圖案,於該裸片21上的導電材料會形成複數傳輸電路31,及複數接觸電極32,該複數傳輸電路31於相反該複數接觸電極32的一端不要塗覆導電材料,以空白出一個區域,雖然圖9中只有示出一組傳輸電路31,及接觸電極32,實際實施時,可於該裸片21上塗覆複數組的電路圖案,不應以本較佳實施例的舉例為限,該裸片21裁切後會形成複數檢測試片的下底板,其中,使用的導電材料為碳粉,並以網版印刷將導電材料塗覆在該裸片21上,實際實施時,可以使用其他的導電材料。Please refer to FIG. 9 , which is a pattern after coating conductive material on the
於該區域塗覆步驟92中,使用一第二網版(圖式未示出)將導電材料塗覆於該裸片21的表面,該第二網版上具有至少一區域圖案,以使導電材料於該裸片21的表面形成一備刻區域33,該備刻區域33中佈滿導電材料,該備刻區域33中的導電材料與該複數傳輸電路31的一端連接,其中,使用的導電材料為碳粉,並以網版印刷將導電材料塗覆在該裸片21上,實際實施時,可以使用其他的導電材料。In the
請參閱圖10,為該裸片21塗覆有該複數傳輸電路31、該複數接觸電極32,及該備刻區域33的狀態,該備刻區域33中佈滿導電材料,該備刻區域33與該複數接觸電極32分設於該複數傳輸電路31的兩端,該備刻區域33中的導電材料與該複數傳輸電路31電連接。Please refer to FIG. 10 , for the
於該區域塗覆步驟92中,塗覆於該裸片21表面的導電材料覆蓋住該複數傳輸電路31的一端,請參閱圖11,該第二網版放置於該裸片21上時,該區域圖案會覆蓋住該複數傳輸電路31的部分區域,當將導電材料以網版印刷的技術進行塗覆時,導電材料會覆蓋該複數傳輸電路31的部分區域,以使該備刻區域33中的導電材料可與該複數傳輸電路31電性連接。In the
於該材料刻除步驟93中,移除該備刻區域33中的部分導電材料,以使該備刻區域33中的導電材料在該複數傳輸電路31的一端形成複數檢測電極34。In the
請參閱圖12,為該裸片21上之複數傳輸電路31、複數接觸電極32,及複數檢測電極34的態樣,該複數檢測電極34與該複數傳輸電路31電連接,該備刻區域33的導電材料被雷射刻除技術進行移除以形成複數檢測電極34,該複數檢測電極34彼此間隔且平行設置,該複數傳輸電路31彼此間隔且平行設置,該複數接觸電極32彼此間隔且平行設置,其中,在雷射刻除後會在該備刻區域33形成多餘的導電層,可以選擇留下或是另外移除,並不會影響作為該檢測試片5的血液偵測目的。Please refer to FIG. 12 , which is the appearance of the
較佳地,於該材料刻除步驟93中,是使用雷射刻除的技術移除該備刻區域33中的部分導電材料,實際實施時,可以使用化學蝕刻、乾式蝕刻、或其他移除導電材料的技術,不應以此為限,由於目前的雷射雕刻機中的雷射光束較為精細,並可以準確控制雷射光束移動的位置,因此可以在該備刻區域33中的導電材料刻除出很細的間距,也可以控制該複數檢測電極34分別成為細長的結構,基於該複數檢測電極34的寬度微細且彼此之間的距離微小,藉此可以縮小該檢測試片之檢測區的設置面積,進一步減少後續製程塗覆該檢測區之反應層的用量。Preferably, in the
請參閱圖13,為本發明一種電極製造方法之一第三較佳實施例,該第三較佳實施例與該第二較佳實施例大致相同,相同之處於此不再詳述,不同之處在於,於該材料刻除步驟93中,該複數檢測電極34平行設置且側邊形成鋸齒形狀35,該複數檢測電極34之相鄰的鋸齒側邊呈凸凹對應設置。Please refer to FIG. 13 , which is a third preferred embodiment of an electrode manufacturing method of the present invention. The third preferred embodiment is substantially the same as the second preferred embodiment. The same parts will not be described in detail here, and the different parts The reason is that, in the
由於該檢測試片的後續製程會在該檢測區的表面塗覆一層反應層,該反應層覆蓋住該複數檢測電極34,以使血糖量測機可以偵測該反應層的電性,由於該複數檢測電極34的側邊形成鋸齒形狀35,可以提升該複數檢測電極34與該反應層電性接觸的面積,可以減少接觸電阻,以使該反應層的偵測數值更加準確,除此之外,因為該複數檢測電極34之相鄰的鋸齒側邊呈凸凹對應設置,可以該複數檢測電極34的間距有效固定,讓該反應層的通電距離固定,有效降低量測該反應層的誤差。Since the subsequent process of the detection test piece will coat a layer of reaction layer on the surface of the detection area, the reaction layer covers the plurality of
值得一提的是,於該第三較佳實施例中,是利用雷射刻除的技術,使複數檢測電極34的側邊形成鋸齒形狀35,實際實施時,在進行該材料刻除步驟93後,該複數檢測電極34的邊緣外觀可形成圓形、矩形或不規則的形狀(如該第一較佳實施例之刻除線23所形成的圓形或不規則形狀的圖案),不應以本較佳實施例的舉例為限。It is worth mentioning that in the third preferred embodiment, the technology of laser ablation is used to form the
請參閱圖10,為本發明一種電極製造方法之一第四較佳實施例,該第四較佳實施例與該第二較佳實施例大致相同,相同之處於此不再詳述,不同之處在於,該電極製造方法更包含一於該區域塗覆步驟92之前的異物清潔步驟94,及一於該材料刻除步驟93之後的品管檢測步驟95。Please refer to FIG. 10 , which is a fourth preferred embodiment of an electrode manufacturing method of the present invention. The fourth preferred embodiment is substantially the same as the second preferred embodiment. The same parts will not be described in detail here. The different parts The advantage is that the electrode manufacturing method further includes a foreign
於該異物清潔步驟94,可以利用滾輪清潔的技術去除該裸片21表面上的異物,也可以利用空氣吹除的技術去除該裸片21表面上的異物,以使該導電材料可以完美的塗覆方式於該裸片21並形成該備刻區域33,由於使用雷射刻除所形成的複數檢測電極34具有結構,及間距微小化的特性,任何沾附的異物都會影響該複數檢測電極34的結構,並造成短路或斷路的狀況,因此將該裸片21表面的異物清除後,再進行導電材料的塗覆是非常重要的。In the foreign
於該導線塗覆步驟91中,該複數傳輸電路31的一端形成複數接觸電極32,於該區域塗覆步驟92中,該備刻區域33與該複數接觸電極32分設於該複數傳輸電路31的兩端,於該品管檢測步驟95中,於該複數檢測電極34上塗覆品管液,以該複數接觸電極32為檢測點,測量該複數傳輸電路31、該複數檢測電極34,及該品管液的電性,用以判斷該複數檢測電極34是否合乎標準。In the
所使用的品管液具有電性特性固定的特點,因此利用該品管液可以測試該複數檢測電極34的結構是否合乎標準,舉例來說,當該品管液的檢測電阻比標準值高時,表示該複數檢測電極34的間距過大,或是該複數檢測電極34具有異物並造成斷路的狀況,當該品管液的檢測電阻比標準值低時,表示雷射雕刻出狀況,並造成該複數檢測電極34的間距過小,所以必須通過品管液的測試步驟,所製造出的檢測試片才具有準確量測血糖的能力,較佳地,可以利用抽檢的方式,針對該裸片21上其中幾組導電層進行電極檢測,實際實施時,也可以全部的導電層進行電極電性的檢測,不應以此為限。The quality control liquid used has the characteristics of fixed electrical properties, so whether the structure of the plurality of
於該導線塗覆步驟91中,包括一第一底層塗覆步驟911,及一第一頂層塗覆步驟912的子步驟,於該第一底層塗覆步驟911中,將銀塗覆於該裸片21的表面,於該第一頂層塗覆步驟912中,將碳塗覆在銀的表面。In the
於該區域塗覆步驟92中,包括一第二底層塗覆步驟921,及一第二頂層塗覆步驟922的子步驟,於該第二底層塗覆步驟921中,將銀塗覆於該裸片21的表面,於該第二頂層塗覆步驟922中,將碳塗覆在銀的表面。In the
較佳地,於該導線塗覆步驟91,及該區域塗覆步驟92中,所使用的銀為銀膠,所使用的碳為碳粉,實際實施時,可使用其他導電材料,不應以此為限,由於銀的導電率較好,所以設置於底層用以傳輸電力,而碳比較耐磨且不易氧化,設置於表層來保護底層的銀。Preferably, in the
由上述說明可知,本發明一種檢測試片5,及電極製造方法確實具有下列功效:As can be seen from the above description, a
一、降低生產成本:1. Reduce production costs:
該檢測試片5中的複數傳輸電路521,及複數接觸電極523是使用成本較低的網版印刷,只有該複數檢測電極522的部分是先利用網板印刷,再執行雷射雕刻,該導電層52不需要全部進行雷射雕刻,有效降低生產成本。The plurality of
二、檢測區微小化:2. The detection area is miniaturized:
使用雷射刻除的技術可以將該複數檢測電極522的結構縮小,並且該複數檢測電極522的間距也可以更加細微,藉此使該檢測區57的面積可以微小化,進一步減少反應層56之反應物的使用量。The structure of the plurality of
三、反應層均勻化:3. Homogenization of the reaction layer:
由於使用雷射刻除的技術可以使該複數檢測電極522的間距縮小,當將反應物塗覆於該複數檢測電極522上時,液體狀態的反應物會均勻地散佈於該複數檢測電極522的表面及縫隙中,當該反應物乾燥後會於該複數檢測電極522上形成厚度均勻的反應層56。Since the laser ablation technology can reduce the distance between the plurality of
綜上所述,由於該複數傳輸電路521,及該複數接觸電極523不需要塗覆反應層56,因此不需要細緻度較高的電路,所以使用成本較低的網版印刷,可以有效降低製造成本,而於需要塗覆該反應層56以需要細緻度較高之電路的複數檢測電極522,再使用可將電極結構微小化並縮小電極間距的雷射刻除技術,可以使該檢測試片5所偵測的血糖數值更為精確,還可以減少該反應層56之反應物的用量,也可以使反應物均勻地設置在該檢測區57中,故確實可以達成本發明之目的。To sum up, since the plurality of
惟以上所述者,僅為本發明之四個較佳實施例而已,當不能以此限定本發明實施之範圍,即大凡依本發明申請專利範圍及發明說明內容所作之簡單的等效變化與修飾,皆仍屬本發明專利涵蓋之範圍內。But the above are only four preferred embodiments of the present invention, and should not limit the scope of the present invention with this, that is, all simple equivalent changes and Modifications still fall within the scope covered by the patent of the present invention.
21:裸片 22:試片邊界 23:刻除線 31:傳輸電路 32:接觸電極 33:備刻區域 34:檢測電極 35:鋸齒形狀 5:檢測試片 51:下底板 52:導電層 521:傳輸電路 522:檢測電極 523:接觸電極 53:中隔板 54:上層板 541:貼附部 542:延伸部 55:容置空間 56:反應層 57:檢測區 58:接觸區 61:第一傳輸電路 611:第一檢測電極 612:第一接觸電極 62:第二傳輸電路 621:第二檢測電極 622:第二接觸電極 63:第三傳輸電路 631:第三檢測電極 632:第三接觸電極 64:第四傳輸電路 641:第四檢測電極 642:第四接觸電極 65:反應層 66:檢測區 67:接觸區 68:上層板 81:塗覆步驟 82:刻除步驟 91:導線塗覆步驟 911:第一底層塗覆步驟 912:第一頂層塗覆步驟 92:區域塗覆步驟 921:第二底層塗覆步驟 922:第二頂層塗覆步驟 93:材料刻除步驟 94:異物清潔步驟 95:品管檢測步驟 21: bare chip 22: Boundary of test piece 23: Engraving line 31: Transmission circuit 32: contact electrode 33: Preparation area 34: Detection electrode 35: Zigzag shape 5: Detection test piece 51: lower bottom plate 52: Conductive layer 521: transmission circuit 522: detection electrode 523: contact electrode 53: Middle partition 54: Upper board 541: Attachment Department 542: Extension 55:Accommodating space 56: Reaction layer 57: Detection area 58: Contact area 61: The first transmission circuit 611: the first detection electrode 612: first contact electrode 62: the second transmission circuit 621: the second detection electrode 622: second contact electrode 63: The third transmission circuit 631: The third detection electrode 632: the third contact electrode 64: The fourth transmission circuit 641: The fourth detection electrode 642: The fourth contact electrode 65: Reaction layer 66: Detection area 67: Contact area 68: Upper board 81: Coating step 82: Engraving steps 91: wire coating step 911: First Primer Coating Step 912: First Top Coating Step 92: Area coating step 921: second primer coating step 922: Second Top Coating Step 93:Material removal step 94: Foreign matter cleaning steps 95: Quality control testing steps
圖1是一流程圖,為本發明一種電極製造方法之一第一較佳實施例; 圖2是一前視示意圖,說明於該第一較佳實施例中,一裸片表面的導電材料,經一刻除步驟後所形成的複數傳輸電路; 圖3是一前視示意圖,說明於該第一較佳實施例中,於該裸片之表面形成一反應層; 圖4是一前視示意圖,說明於該第一較佳實施例中,於該裸片形成一檢測區及一接觸區; 圖5是一立體示意圖,為本發明一種檢測試片之一第二較佳實施例,說明該檢測試片的立體態樣; 圖6是一分解示意圖,說明於該第二較佳實施例中,該檢測試片的分解態樣; 圖7是一剖面示意圖,說明於該第二較佳實施例中,該檢測試片的剖面態樣;及 圖8是一流程圖,說明於該第二較佳實施例中,設置於該檢測試片中之電極的製造方法; 圖9是一前視示意圖,說明於該第二較佳實施例之電極製造方法中,於一導線塗覆步驟中,於一裸片上塗覆導電材料後形成之複數傳輸電路,及複數接觸電極; 圖10是一前視示意圖,說明於該第二較佳實施例之電極製造方法中,於一區域塗覆步驟中,於該裸片上塗覆另一導電材料後形成一備刻區域; 圖11是一剖面示意圖,說明於該第二較佳實施例中之電極製造方法中,於該區域塗覆步驟中,導電材料形成的備刻區域中覆蓋該傳輸電路的裸片剖面態樣; 圖12是一前視示意圖,說明於該第二較佳實施例之電極製造方法中,於一材料刻除步驟中,將該備刻區域中的導電材料刻除後,形成複數檢測電極與複數傳輸電路,及複數接觸電極的裸片前視態樣; 圖13是一局部示意圖,為本發明一種檢測試片之一第三較佳實施例,說明具有鋸齒形狀之複數檢測電極的外觀;及 圖14是一流程圖,為本發明一種檢測試片之電極製造方法的一第四較佳實施例。 Fig. 1 is a flow chart, is one of first preferred embodiment of a kind of electrode manufacturing method of the present invention; Fig. 2 is a schematic front view, illustrating in the first preferred embodiment, the conductive material on the surface of a bare chip, and the complex transmission circuits formed after the etching step; Fig. 3 is a schematic front view illustrating that in the first preferred embodiment, a reaction layer is formed on the surface of the die; FIG. 4 is a schematic front view illustrating that a detection region and a contact region are formed on the die in the first preferred embodiment; Fig. 5 is a three-dimensional schematic diagram, which is a second preferred embodiment of a detection test piece of the present invention, illustrating the three-dimensional appearance of the detection test piece; Fig. 6 is an exploded schematic diagram illustrating the disassembled state of the detection test piece in the second preferred embodiment; Fig. 7 is a schematic cross-sectional view illustrating the cross-sectional appearance of the test strip in the second preferred embodiment; and Fig. 8 is a flow chart, illustrates in this second preferred embodiment, is arranged on the manufacturing method of the electrode in this test piece; 9 is a schematic front view illustrating a plurality of transmission circuits and a plurality of contact electrodes formed after coating a bare chip with a conductive material in a wire coating step in the electrode manufacturing method of the second preferred embodiment ; 10 is a schematic front view illustrating that in the electrode manufacturing method of the second preferred embodiment, in an area coating step, another conductive material is coated on the die to form a preparation area; 11 is a schematic cross-sectional view illustrating the cross-sectional appearance of the die covering the transmission circuit in the preparation area formed by conductive material in the area coating step in the electrode manufacturing method in the second preferred embodiment; Fig. 12 is a schematic front view illustrating that in the electrode manufacturing method of the second preferred embodiment, in a material etching step, after the conductive material in the preparation area is etched, a plurality of detection electrodes and a plurality of detection electrodes are formed. The front view of the bare chip of the transmission circuit and the plurality of contact electrodes; Fig. 13 is a partial schematic diagram, which is a third preferred embodiment of a detection test piece of the present invention, illustrating the appearance of a plurality of detection electrodes having a zigzag shape; and Fig. 14 is a flow chart of a fourth preferred embodiment of a method for manufacturing an electrode of a test strip according to the present invention.
91:導線塗覆步驟 91: wire coating step
92:區域塗覆步驟 92: Area coating step
93:材料刻除步驟 93:Material removal step
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