TW202306015A - Wafer transfer device, vapor deposition system and use method thereof preventing the upper surface of the undeposited wafer from being polluted by contact - Google Patents
Wafer transfer device, vapor deposition system and use method thereof preventing the upper surface of the undeposited wafer from being polluted by contact Download PDFInfo
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本發明涉及半導體製造技術領域,尤其涉及一種晶圓傳送裝置、氣相沉積系統及使用方法。The invention relates to the technical field of semiconductor manufacturing, in particular to a wafer transfer device, a vapor deposition system and a use method.
採用氣相沉積設備(CVD)對晶圓進行處理時,通常需要將晶圓從晶圓盒內取出並放至晶圓托盤內,再將晶圓托盤傳送至負載鎖定腔室。目前將晶圓從晶圓盒內取出並放入晶圓托盤這一步驟主要由人工完成,然而人工手動取放晶圓的方式,不僅效率低,還容易污染晶圓的上表面,進而影響晶圓的良率。尤其是隨著工藝的不斷變化,氣相沉積設備對於晶圓表面污染顆粒的敏感度也在不斷增加,因此,為保證晶圓的處理效率和良率,有必要對取放晶圓的方式進行更改或調整。Wafer processing using vapor deposition equipment (CVD) typically requires removal of wafers from cassettes and placement in wafer trays, which are then transferred to a load-lock chamber. At present, the step of taking the wafer out of the wafer cassette and placing it into the wafer tray is mainly done manually. However, the method of manually picking and placing the wafer is not only inefficient, but also easily pollutes the upper surface of the wafer, thereby affecting the quality of the wafer. Circle yield. Especially with the continuous change of the process, the sensitivity of the vapor deposition equipment to the contamination particles on the wafer surface is also increasing. Therefore, in order to ensure the processing efficiency and yield of the wafer, it is necessary to change the way of picking and placing the wafer or adjust.
本發明的目的在於提供一種晶圓傳送裝置、氣相沉積系統及使用方法,以在將晶圓從晶圓盒組傳送至負載鎖定腔室的過程中避免與晶圓的上表面接觸,從而提高晶圓的上表面的潔淨度。The purpose of the present invention is to provide a wafer transfer device, a vapor deposition system and a method of use, so as to avoid contact with the upper surface of the wafer during the transfer of the wafer from the wafer cassette group to the load lock chamber, thereby improving The cleanliness of the upper surface of the wafer.
為了達到上述目的,本發明通過以下技術方案實現:In order to achieve the above object, the present invention is achieved through the following technical solutions:
一種晶圓傳送裝置,用於氣相沉積設備中晶圓和晶圓托盤的移動,包括:A wafer transfer device for movement of wafers and wafer trays in vapor deposition equipment, comprising:
晶圓盒組,與氣相沉積設備的負載鎖定腔室相對設置,用於存儲所述晶圓;a wafer cassette group, arranged opposite to the load lock chamber of the vapor deposition apparatus, for storing the wafer;
托盤台,用於承載所述晶圓托盤;a tray table for carrying the wafer tray;
第一傳送機構,用於將所述晶圓托盤在所述托盤台和所述負載鎖定腔室之間進行傳送;a first transport mechanism for transporting the wafer tray between the tray table and the load lock chamber;
第二傳送機構,用於從所述晶圓托盤上將沉積後晶圓取出;The second transfer mechanism is used to take out the deposited wafer from the wafer tray;
第三傳送機構,其包括承載臂,用於將沉積後晶圓放入所述晶圓盒組以及將未沉積晶圓從所述晶圓盒組中取出;夾持臂,用於將未沉積晶圓放入所述晶圓托盤中。The third transfer mechanism, which includes a carrying arm, is used to put the deposited wafer into the wafer box group and undeposited wafers are taken out from the wafer box group; a clamping arm is used to place the undeposited wafer Wafers are placed in the wafer tray.
優選地,所述托盤台設置於所述晶圓盒組與所述負載鎖定腔室之間;Preferably, the tray table is disposed between the cassette group and the load lock chamber;
所述第一傳送機構設置於所述托盤台和所述負載鎖定腔室之間;the first transfer mechanism is disposed between the pallet table and the load lock chamber;
所述第二傳送機構設置於所述第一傳送機構和所述晶圓盒組之間;The second conveying mechanism is arranged between the first conveying mechanism and the wafer cassette group;
所述第三傳送機構設置於所述第二傳送機構和所述晶圓盒組之間。The third conveying mechanism is disposed between the second conveying mechanism and the wafer cassette group.
優選地,所述晶圓傳送裝置,還包括:晶圓校準器;所述晶圓校準器設置於所述托盤台和所述第三傳送機構之間,用於對所述晶圓進行定位。Preferably, the wafer transfer device further includes: a wafer aligner; the wafer aligner is disposed between the tray table and the third transfer mechanism, and is used for positioning the wafer.
優選地,所述托盤台可帶動所述晶圓托盤旋轉。Preferably, the tray table can drive the wafer tray to rotate.
優選地,所述晶圓傳送裝置,還包括:第一傳感器,用於檢測所述托盤台的轉動速度及停止位置。Preferably, the wafer transfer device further includes: a first sensor for detecting the rotation speed and stop position of the tray table.
優選地,所述第二傳送機構的前端設有吸盤,以從所述晶圓托盤中吸起沉積後晶圓。Preferably, a suction cup is provided at the front end of the second transport mechanism to suck up the deposited wafer from the wafer tray.
優選地,所述第三傳送機構的所述承載臂的前端設有貨叉,以托舉所述晶圓背面;所述夾持臂的前端設有鉗口,以夾持所述晶圓側面;且所述承載臂和所述夾持臂沿豎直方向間隔設置。Preferably, the front end of the carrying arm of the third transport mechanism is provided with a fork to lift the back of the wafer; the front end of the clamping arm is provided with jaws to clamp the side of the wafer ; and the carrying arm and the clamping arm are arranged at intervals along the vertical direction.
優選地,所述晶圓傳送裝置,還包括:托盤櫃;所述托盤櫃與所述第一傳送機構相鄰設置,用於存放所述晶圓托盤;且所述托盤櫃設有第一門和第二門,所述第一門朝向所述第一傳送機構,所述第二門朝向所述晶圓傳送裝置的外面。Preferably, the wafer transfer device further includes: a tray cabinet; the tray cabinet is arranged adjacent to the first transfer mechanism for storing the wafer tray; and the tray cabinet is provided with a first door and a second door, the first door faces the first transfer mechanism, and the second door faces the outside of the wafer transfer device.
優選地,所述第一門和所述第二門互鎖。Preferably, said first door and said second door are interlocked.
優選地,所述托盤櫃內設有第二傳感器,用於監測所述晶圓托盤的存放位置。Preferably, a second sensor is provided in the tray cabinet for monitoring the storage position of the wafer tray.
另一方面,本發明還提供一種氣相沉積系統,包括:反應腔、與所述反應腔連接的傳送室、與所述傳送室連接的負載鎖定腔室,以及如上述的晶圓傳送裝置。On the other hand, the present invention also provides a vapor deposition system, comprising: a reaction chamber, a transfer chamber connected to the reaction chamber, a load-lock chamber connected to the transfer chamber, and the above-mentioned wafer transfer device.
優選地,所述反應腔與對應的電氣系統及供氣系統連接,且三者成線性排列。Preferably, the reaction chamber is connected to the corresponding electrical system and gas supply system, and the three are arranged in a linear manner.
優選地,所述負載鎖定腔室包括第一負載鎖定腔室和第二負載鎖定腔室;所述第一負載鎖定腔室用於存放裝載未沉積晶圓的所述晶圓托盤時,所述第二負載鎖定腔室可以存放裝載沉積後晶圓的所述晶圓托盤。Preferably, the load lock chamber includes a first load lock chamber and a second load lock chamber; when the first load lock chamber is used to store the wafer tray loaded with undeposited wafers, the The second load lock chamber may store the wafer tray loaded with deposited wafers.
優選地,所述傳送室的橫截面為六邊形結構;其中,所述傳送室的一個側面與托盤冷卻室連接;Preferably, the cross-section of the transfer chamber is a hexagonal structure; wherein, one side of the transfer chamber is connected to the tray cooling chamber;
所述傳送室的兩個相鄰側面分別與所述第一負載鎖定腔室和所述第二負載鎖定腔室連接;Two adjacent sides of the transfer chamber are respectively connected to the first load lock chamber and the second load lock chamber;
所述傳送室的三個側面分別與三個所述反應腔連接,且所述晶圓傳送裝置與其中一個所述反應腔平行設置。Three sides of the transfer chamber are respectively connected to the three reaction chambers, and the wafer transfer device is arranged parallel to one of the reaction chambers.
另一方面,本發明還提供一種如上述的晶圓傳送裝置的使用方法,包括:上料操作和下料操作;On the other hand, the present invention also provides a method for using the above-mentioned wafer transfer device, including: loading operation and unloading operation;
其中,所述上料操作包括:Wherein, the feeding operation includes:
第一傳送機構將晶圓托盤放至托盤台上;The first transfer mechanism puts the wafer tray on the tray table;
第三傳送機構的承載臂將未沉積晶圓從晶圓盒組中取出;The carrying arm of the third conveying mechanism takes out the undeposited wafer from the wafer cassette group;
所述第三傳送機構的夾持臂將未沉積晶圓放入所述晶圓托盤中;The clamping arm of the third transfer mechanism puts undeposited wafers into the wafer tray;
所述第一傳送機構將所述晶圓托盤從所述托盤台移至負載鎖定腔室;the first transfer mechanism moves the wafer tray from the tray table to a load lock chamber;
所述下料操作包括:Described unloading operation comprises:
所述第一傳送機構將裝載沉積後晶圓的所述晶圓托盤從所述負載鎖定腔室移至所述托盤台;The first transfer mechanism moves the wafer tray loaded with deposited wafers from the load lock chamber to the tray table;
第二傳送機構從所述晶圓托盤上將沉積後晶圓取出;The second transfer mechanism takes out the deposited wafer from the wafer tray;
所述第三傳送機構的所述承載臂將沉積後晶圓放入所述晶圓盒組。The carrying arm of the third conveying mechanism puts the deposited wafer into the cassette group.
優選地,執行所述上料操作時,所述承載臂將未沉積晶圓從所述晶圓盒組中托起並放至晶圓校準器上;所述夾持臂從所述晶圓校準器上將所述未沉積晶圓夾起並放入所述晶圓托盤中;Preferably, when performing the loading operation, the carrying arm lifts the undeposited wafer from the cassette group and puts it on the wafer aligner; the clamping arm aligns the wafer from the wafer pick up the undeposited wafer on the machine and put it into the wafer tray;
執行所述下料操作時,所述第二傳送機構從所述晶圓托盤上將沉積後晶圓吸起並放至所述晶圓校準器上;所述承載臂從所述晶圓校準器上將沉積後晶圓托起並放入所述晶圓盒組。When performing the unloading operation, the second conveying mechanism sucks up the deposited wafer from the wafer tray and puts it on the wafer aligner; The deposited wafer is picked up and put into the wafer box group.
優選地,執行所述上料操作時,所述托盤台帶動所述晶圓托盤旋轉,使所述晶圓托盤的每一盤坑依序停至第一預設位置與所述夾持臂配合放置未沉積晶圓;Preferably, when performing the loading operation, the tray table drives the wafer tray to rotate, so that each tray hole of the wafer tray sequentially stops to a first preset position to cooperate with the clamping arm Place the undeposited wafer;
執行所述下料操作時,所述托盤台帶動所述晶圓托盤旋轉,使所述晶圓托盤的每一所述盤坑依序停至第二預設位置與所述第二傳送機構配合取出沉積後晶圓。When performing the unloading operation, the tray table drives the wafer tray to rotate, so that each of the tray pits of the wafer tray sequentially stops to a second preset position to cooperate with the second transmission mechanism Remove the post-deposition wafer.
優選地,所述負載鎖定腔室的數量為2個;Preferably, the number of load lock chambers is 2;
所述第一傳送機構將裝載未沉積晶圓的所述晶圓托盤放入一個所述負載鎖定腔室後,從另一個所述負載鎖定腔室取出裝載沉積後晶圓的所述晶圓托盤。After the first transfer mechanism puts the wafer tray loaded with undeposited wafers into one of the load lock chambers, the wafer tray loaded with deposited wafers is taken out from the other load lock chamber .
本發明與現有技術相比至少具有以下優點之一:Compared with the prior art, the present invention has at least one of the following advantages:
本發明提供的一種晶圓傳送裝置、氣相沉積系統及使用方法,通過第一傳送機構、第二傳送機構及第三傳送機構中承載臂和夾持臂的配合,可以將未沉積的晶圓從晶圓盒組傳送至負載鎖定腔室以及將沉積後的晶圓從負載鎖定腔室傳送至晶圓盒組,既實現了晶圓傳輸的自動化,又避免了未沉積的晶圓上表面被接觸污染,極大提高了晶圓的傳輸效率及晶圓上表面的潔淨度。The present invention provides a wafer transfer device, a vapor deposition system, and a method for using it. Through the cooperation of the carrying arm and the clamping arm in the first transfer mechanism, the second transfer mechanism, and the third transfer mechanism, the undeposited wafer can be Transfer from the cassette group to the load lock chamber and transfer the deposited wafers from the load lock chamber to the cassette group, which not only realizes the automation of wafer transfer, but also prevents the upper surface of the undeposited wafer from being damaged. Contact pollution greatly improves the transfer efficiency of the wafer and the cleanliness of the upper surface of the wafer.
本發明中通過第三傳送機構的承載臂托舉未沉積的晶圓時,承載臂前端的貨叉與未沉積的晶圓下表面接觸;通過夾持臂夾起未沉積的晶圓時,夾持臂前端的鉗口與未沉積的晶圓的側面接觸,從而使得第三傳送機構在將晶圓從晶圓盒組移至晶圓托盤的過程中可以避免與未沉積的晶圓的上表面接觸,進而提高晶圓的上表面的潔淨度。In the present invention, when the undeposited wafer is lifted by the carrying arm of the third conveying mechanism, the fork at the front end of the carrying arm contacts the lower surface of the undeposited wafer; The jaws at the front end of the holding arm are in contact with the side of the undeposited wafer, so that the third transfer mechanism can avoid contact with the upper surface of the undeposited wafer during the process of moving the wafer from the wafer cassette group to the wafer tray. Contact, thereby improving the cleanliness of the upper surface of the wafer.
本發明中第一傳送機構可以將裝載未沉積晶圓的晶圓托盤傳送至負載鎖定腔室,從而能夠在將未沉積的晶圓從托盤台移至負載鎖定腔室的過程中避免與晶圓的上表面接觸,進而提高晶圓的上表面的潔淨度。In the present invention, the first transfer mechanism can transfer the wafer tray loaded with undeposited wafers to the load lock chamber, thereby avoiding contact with the wafer during the process of moving the undeposited wafers from the tray table to the load lock chamber. contact with the upper surface of the wafer, thereby improving the cleanliness of the upper surface of the wafer.
本發明中托盤台可以帶動晶圓托盤進行旋轉,並將晶圓托盤的每一盤坑依序停至第一預設位置或第二預設位置,從而使得第三傳送機構的夾持臂或第二傳送機構能夠在固定位置完成對所有未沉積的晶圓的放置操作或對所有沉積後的晶圓的吸起操作。In the present invention, the tray table can drive the wafer tray to rotate, and stop each disc pit of the wafer tray to the first preset position or the second preset position in sequence, so that the clamping arm of the third transmission mechanism or The second transport mechanism can complete the placing operation of all undeposited wafers or the suction operation of all deposited wafers at a fixed position.
本發明中托盤櫃朝向第一傳送機構的第一門和朝向外面的第二門具有互鎖結構,使得第一門和第二門無法同時開啟,從而確保從外界向托盤櫃存放晶圓托盤時,第一傳送機構無法同時從托盤櫃取出晶圓托盤,進而既能保證托盤櫃的操作安全又能控制晶圓傳送裝置內部的潔淨程度。In the present invention, the first door of the tray cabinet facing the first transfer mechanism and the second door facing the outside have an interlocking structure, so that the first door and the second door cannot be opened at the same time, thereby ensuring that when wafer trays are stored from the outside to the tray cabinet , the first transfer mechanism cannot take out the wafer trays from the tray cabinet at the same time, thereby not only ensuring the operation safety of the tray cabinet but also controlling the cleanliness inside the wafer transfer device.
以下結合附圖和具體實施方式對本發明提出的一種晶圓傳送裝置、氣相沉積系統及使用方法作進一步詳細說明。根據下面說明,本發明的優點和特徵將更清楚。需要說明的是,附圖採用非常簡化的形式且均使用非精準的比例,僅用以方便、明晰地輔助說明本發明實施方式的目的。為了使本發明的目的、特徵和優點能夠更加明顯易懂,請參閱附圖。須知,本說明書所附圖式所繪示的結構、比例、大小等,均僅用以配合說明書所揭示的內容,以供熟悉此技術的人士瞭解與閱讀,並非用以限定本發明實施的限定條件,故不具技術上的實質意義,任何結構的修飾、比例關係的改變或大小的調整,在不影響本發明所能產生的功效及所能達成的目的下,均應仍落在本發明所揭示的技術內容能涵蓋的範圍內。A wafer transfer device, a vapor deposition system and a method of use proposed by the present invention will be further described in detail below in conjunction with the drawings and specific embodiments. The advantages and features of the present invention will become clearer from the following description. It should be noted that the drawings are in a very simplified form and all use imprecise scales, which are only used to facilitate and clearly assist the purpose of illustrating the embodiments of the present invention. In order to make the objects, features and advantages of the present invention more comprehensible, please refer to the accompanying drawings. It should be noted that the structures, proportions, sizes, etc. shown in the drawings attached to this specification are only used to match the content disclosed in the specification, for those who are familiar with this technology to understand and read, and are not used to limit the implementation of the present invention. condition, so it has no technical substantive meaning, and any modification of structure, change of proportional relationship or adjustment of size shall still fall within the scope of the present invention without affecting the effect and purpose of the present invention. within the scope covered by the disclosed technical content.
需要說明的是,在本文中,諸如第一和第二等之類的關係術語僅僅用來將一個實體或者操作與另一個實體或操作區分開來,而不一定要求或者暗示這些實體或操作之間存在任何這種實際的關係或者順序。而且,術語“包括”、“包含”或者其任何其他變體意在涵蓋非排他性的包含,從而使得包括一系列要素的過程、方法、物品或者設備不僅包括那些要素,而且還包括沒有明確列出的其他要素,或者是還包括為這種過程、方法、物品或者設備所固有的要素。在沒有更多限制的情況下,由語句“包括一個……”限定的要素,並不排除在包括所述要素的過程、方法、物品或者設備中還存在另外的相同要素。It should be noted that in this article, relational terms such as first and second are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply that there is a relationship between these entities or operations. There is no such actual relationship or order between them. Furthermore, the term "comprises", "comprises" or any other variation thereof is intended to cover a non-exclusive inclusion such that a process, method, article, or apparatus comprising a set of elements includes not only those elements, but also includes elements not expressly listed. other elements of or also include elements inherent in such a process, method, article, or device. Without further limitations, an element defined by the phrase "comprising a ..." does not exclude the presence of additional identical elements in the process, method, article or apparatus comprising said element.
結合圖1~2所示,本實施例提供一種晶圓傳送裝置,用於氣相沉積設備中晶圓和晶圓托盤的移動,包括:晶圓盒組110,與氣相沉積設備的負載鎖定腔室210相對設置,用於存儲所述晶圓;托盤台120,用於承載所述晶圓托盤;第一傳送機構130,用於將所述晶圓托盤在所述托盤台120和所述負載鎖定腔室210之間進行傳送;第二傳送機構140,用於從所述晶圓托盤上將沉積後晶圓取出;第三傳送機構150,其包括承載臂1501,用於將沉積後晶圓放入所述晶圓盒組110以及將未沉積晶圓從所述晶圓盒組110中取出;夾持臂1502,用於將未沉積晶圓放入所述晶圓托盤中。As shown in Figures 1-2, this embodiment provides a wafer transfer device for moving wafers and wafer trays in vapor deposition equipment, including: a
請繼續參考圖1,所述托盤台120設置於所述晶圓盒組110與所述負載鎖定腔室210之間;所述第一傳送機構130設置於所述托盤台120和所述負載鎖定腔室210之間;所述第二傳送機構140設置於所述第一傳送機構130和所述晶圓盒組110之間;所述第三傳送機構150設置於所述第二傳送機構140和所述晶圓盒組110之間。Please continue to refer to FIG. 1, the tray table 120 is arranged between the
具體的,在本實施例中,所述晶圓傳送裝置中的所述晶圓盒組110、所述第三傳送機構150、所述托盤台120、所述第二傳送機構140以及所述第一傳送機構130等部件可以呈線性排列,使得各部件可以按照工藝流程進行有序作業,且各部件根據作業先後順序可以形成流水線,從而使得所述晶圓傳送裝置具有高度的自動化水平。更具體的,根據實際使用場地的需求,可以對所述晶圓傳送裝置中各部件進行靈活佈局,例如可以將各部件擺放成直線型,也可以將各部件擺放成傾斜彎曲型,從而能夠在滿足各部件作業順序的前提下,將整個所述晶圓傳送裝置適宜地安裝於實際使用場地中,進而提高所述晶圓傳送裝置的適用性。優選地,所述晶圓傳送裝置中各部件可以擺放成直線型,且所述晶圓傳送裝置可以和反應腔(包括供氣供電設備)平行排列,以達到可直接在人工操作的舊設備上去掉一反應腔,在被去掉的反應腔位置安裝本實施例的晶圓傳送裝置的目的,依次減低改造難度,但本發明不以此為限。Specifically, in this embodiment, the
具體的,在本實施例中,所述晶圓盒組110可以包括第一晶圓盒111和第二晶圓盒112;所述第一晶圓盒111用於存儲未沉積的晶圓,所述第二晶圓盒112用於存儲沉積後的晶圓。更具體的,未沉積的晶圓經所述第三傳送機構150、所述第二傳送機構140及所述第一傳送機構130從所述第一晶圓盒111傳送至所述負載鎖定腔室210後,再經傳送室傳輸至所述反應腔進行沉積處理;沉積後的晶圓則經所述傳送室從所述反應腔傳輸至所述負載鎖定腔室後,再經所述第一傳送機構130、所述第二傳送機構140及所述第三傳送機構150傳送至所述第二晶圓盒112進行存儲。優選地,所述第一晶圓盒111和所述第二晶圓盒112皆可採用開放式晶圓盒或SMIF(晶圓隔離)式晶圓盒,但本發明不以此為限。Specifically, in this embodiment, the
請繼續參考圖1,所述晶圓傳送裝置,還包括:托盤櫃170;所述托盤櫃170與所述第一傳送機構130相鄰設置,用於存放所述晶圓托盤;且所述托盤櫃170設有第一門和第二門,所述第一門朝向所述第一傳送機構130,所述第二門朝向所述晶圓傳送裝置的外面。Please continue to refer to FIG. 1, the wafer transfer device also includes: a
可以理解的是,在一些其他的實施例中,所述第一門和所述第二門互鎖。It can be understood that, in some other embodiments, the first door and the second door are interlocked.
在一些實施例中,所述托盤櫃170內設有第二傳感器,用於監測所述晶圓托盤的存放位置。In some embodiments, the
具體的,在本實施例中,所述托盤櫃170的所述第二門朝向外面,使得工作人員或FA自動化設備(例如AGV小車)可以通過所述第二門將空的所述晶圓托盤放至所述托盤櫃170內。位於所述托盤櫃170內的所述第二傳感器則可以監測所述晶圓托盤是否精準地放至預設存放處,以防止所述晶圓托盤擺放不正,從而避免後續第一傳送機構130自動取盤時發生錯誤;更具體的,若所述晶圓托盤未放至所述預設存放處,所述第二傳感器則會提示工作人員對所述晶圓托盤的位置進行調整。所述托盤櫃170的所述第一門朝向所述第一傳送機構130,使得所述第一傳送機構130可以通過所述第一門將空的所述晶圓托盤從所述托盤櫃170取出並放至所述托盤台120上,以裝載所述晶圓,但本發明不以此為限。Specifically, in this embodiment, the second door of the
在其他的實施例中,當所述晶圓傳送裝置中的所述晶圓托盤需要更換時,所述第一傳送機構130還可以通過所述第一門將待更換的所述晶圓托盤放入所述托盤櫃170內,且工作人員或FA自動化設備可以通過所述第二門將待更換的所述晶圓托盤從所述托盤櫃170取出並放入新的所述晶圓托盤,從而完成對所述晶圓托盤的更換,但本發明不以此為限。In other embodiments, when the wafer tray in the wafer transfer device needs to be replaced, the
具體的,在本實施例中,所述托盤櫃170的所述第一門和所述第二門具有互鎖結構,使得所述第一門和所述第二門無法同時開啟,即所述第一門開啟時所述第二門無法開啟或所述第二門開啟時所述第一門無法開啟,從而確保從外面向所述托盤櫃170存放所述晶圓托盤時,所述第一傳送機構130無法同時從所述托盤櫃170取出所述晶圓托盤,進而既能保證所述托盤櫃170的操作安全又能控制所述晶圓傳送裝置內部的潔淨程度,但本發明不以此為限。Specifically, in this embodiment, the first door and the second door of the
請同時參考圖1和圖2,所述第三傳送機構150的所述承載臂1501的前端設有貨叉,以托舉所述晶圓;所述夾持臂1502的前端設有鉗口,可以為與所述晶圓相同曲率的弧形鉗口,以夾持所述晶圓;且所述承載臂1501和所述夾持臂1502沿豎直方向間隔設置,互相之間不干涉移動路徑。Please refer to FIG. 1 and FIG. 2 at the same time, the front end of the carrying
可以理解的是,在一些其他的實施例中,所述貨叉與未沉積晶圓的下表面即背面接觸;所述鉗口與未沉積晶圓的側面接觸。It can be understood that, in some other embodiments, the fork is in contact with the lower surface of the undeposited wafer, that is, the back surface; the jaw is in contact with the side of the undeposited wafer.
在一些實施例中,所述晶圓傳送裝置,還包括:晶圓校準器160;所述晶圓校準器160設置於所述托盤台120和所述第三傳送機構150之間,用於對所述晶圓進行定位。In some embodiments, the wafer transfer device further includes: a
具體的,在本實施例中,所述第三傳送機構150中所述承載臂1501的所述貨叉可以將未沉積晶圓從所述第一晶圓盒111中托起並放至所述晶圓校準器160上,以對未沉積晶圓進行位置校準;所述夾持臂1502的所述鉗口則可以從所述晶圓校準器160上夾起未沉積晶圓並放至位於所述托盤台120上的所述晶圓托盤中,再由所述第一傳送機構130將載滿未沉積晶圓的所述晶圓托盤放至所述負載鎖定腔室210。更具體的,托舉未沉積晶圓時所述承載臂1501的所述貨叉與未沉積晶圓的下表面接觸,夾持未沉積晶圓時所述夾持臂1502的所述鉗口與未沉積晶圓的側面接觸,從而能夠在將未沉積晶圓從所述第一晶圓盒111移至所述晶圓托盤的過程中,有效避免所述第三傳送機構150與未沉積晶圓的上表面接觸,進而提高未沉積晶圓的上表面潔淨度。優選地,所述承載臂1501和所述夾持臂1502皆可以由多段機械臂組成,使得所述承載臂1501和所述夾持臂1502可以進行伸縮旋轉等靈活移動動作;所述晶圓校準器160的直徑小於所述晶圓的直徑,以為所述承載臂1501留出操作空間,但本發明不以此為限。Specifically, in this embodiment, the forks of the carrying
請繼續參考圖1,所述第二傳送機構140的前端設有吸盤,以從所述晶圓托盤中吸起沉積後晶圓。Please continue to refer to FIG. 1 , a suction cup is provided at the front end of the
具體的,在本實施例中,所述第一傳送機構130從所述負載鎖定腔室210將裝載沉積後晶圓的所述晶圓托盤放至所述托盤台120上後,所述第二傳送機構140可以通過所述吸盤從所述晶圓托盤中將沉積後晶圓吸起並放至所述晶圓校準器160上,再由所述第三傳送機構150的所述承載臂1501從所述晶圓校準器160上將沉積後晶圓托起並放至所述第二晶圓盒112內。更具體的,所述吸盤可以為圓形吸盤;若所述吸盤的直徑小於沉積後晶圓的直徑,則所述吸盤可以吸附沉積後晶圓的中心;若所述吸盤的直徑等於沉積後晶圓的直徑,則所述吸盤可以吸附沉積後晶圓的邊緣。優選地,所述吸盤可以為伯努利吸盤,但本發發明不以此為限。Specifically, in this embodiment, after the
在其他的實施例中,所述第二傳送機構140還可以通過其他方式將沉積後晶圓從所述晶圓托盤中吸起。In other embodiments, the
請繼續參考圖1,所述托盤台120可帶動所述晶圓托盤旋轉。Please continue to refer to FIG. 1 , the tray table 120 can drive the wafer tray to rotate.
可以理解的是,在一些其他的實施例中,所述晶圓傳送裝置還包括:第一傳感器,用於檢測所述托盤台的轉動速度及停止位置。It can be understood that, in some other embodiments, the wafer transfer device further includes: a first sensor, configured to detect the rotation speed and stop position of the tray table.
具體的,在本實施例中,所述晶圓托盤上可以設有若干個盤坑,每一所述盤坑用於容置一所述晶圓,且所有所述盤坑可以沿所述晶圓托盤的周向進行等間隔設置,但本發明不以此為限。Specifically, in this embodiment, several disk pits may be provided on the wafer tray, each of the disk pits is used to accommodate a wafer, and all the disk pits may be arranged along the wafer tray. The circular trays are arranged at equal intervals in the circumferential direction, but the present invention is not limited thereto.
具體的,在本實施例中,所述第一傳送機構130將所述晶圓托盤放至所述托盤台120上後,所述托盤台120可以受控帶動所述晶圓托盤進行旋轉,以將所述晶圓托盤的每一所述盤坑依序轉至第一預設位置,從而使得所述第三傳送機構150的所述夾持臂1502可以將未沉積晶圓放入對應的所述盤坑內,進而使得所述夾持臂1502可以在同一位置完成對所有未沉積晶圓的放置操作。所述托盤台120還可以受控帶動裝載沉積後晶圓的所述晶圓托盤進行旋轉,以將所述晶圓托盤的每一所述盤坑依序轉至第二預設位置,從而使得所述第二傳送機構140可以從對應的所述盤坑內將沉積後晶圓吸起,進而使得所述第二傳送機構140可以在同一位置完成對所有沉積後晶圓的吸起操作。優選地,所述第一預設位置可以為所述夾持臂1502執行放置未沉積晶圓操作的位置;所述第二預設位置可以為所述第二傳送機構140執行吸起沉積後晶圓操作的位置,但本發明不以此為限。Specifically, in this embodiment, after the
具體的,在本實施例中,所述第一傳感器可以固定於任意不動處,且所述第一傳感器可以與所述托盤台120的上表面、下表面或側面等相對設置,從而能夠在所述托盤台120旋轉過程中對其轉動方向及停止位置進行檢測,進而保證所述第二傳送機構140和所述第三傳送機構150可以準確地取放所述晶圓。更具體的,若所述第一傳感器檢測到所述托盤台120的轉動速度及停止位置與預設轉動速度或預設停止位置不一致,所述第一傳感器則會提示工作人員對所述托盤台120進行故障排查。優選地,所述托盤台120上可以設置若干個標記點,以配合所述第一傳感器對所述托盤台120進行定位;所述預設轉動方向可以為順時針方向或逆時針方向;所述預設停止位置可以為所述第一預設位置和所述第二預設位置,所述但本發明不以此為限。Specifically, in this embodiment, the first sensor can be fixed at any fixed place, and the first sensor can be set opposite to the upper surface, lower surface or side of the tray table 120, so that it can During the rotation process of the tray table 120, the rotation direction and stop position are detected, so as to ensure that the
結合附圖3所示,本實施例還提供一種氣相沉積系統,包括:反應腔230、與所述反應腔230連接的傳送室220、與所述傳送室220連接的負載鎖定腔室210,以及如上所述的晶圓傳送裝置100。As shown in FIG. 3 , this embodiment also provides a vapor deposition system, including: a
請繼續參考圖3,所述負載鎖定腔室210包括第一負載鎖定腔室和第二負載鎖定腔室;所述第一負載鎖定腔室用於存放裝載未沉積晶圓的所述晶圓托盤時,所述第二負載鎖定腔室可以存放裝載沉積後晶圓的所述晶圓托盤;所述第一負載鎖定腔室用於存放裝載沉積後晶圓的所述晶圓托盤時,所述第二負載鎖定腔室可以存放裝載未沉積晶圓的所述晶圓托盤。Please continue to refer to FIG. 3 , the
具體的,在本實施例中,未沉積晶圓可以通過所述晶圓傳送裝置100從第一晶圓盒111傳送至所述第一負載鎖定腔室,以及通過所述傳送室220中的機器人從所述第一負載鎖定腔室傳輸至所述反應腔230進行沉積處理;沉積後晶圓則可以通過所述傳送室220中的機器人從所述反應腔230傳輸至所述第二負載鎖定腔室,以及通過所述晶圓傳送裝置100從所述第二負載鎖定腔室傳送至第二晶圓盒112進行存儲。優選地,所述第一負載鎖定腔室和所述第二負載鎖定腔室可以同時存放裝載不同狀態晶圓(包括未沉積晶圓和沉積後晶圓)的所述晶圓托盤,以提高未沉積晶圓和沉積後晶圓在所述晶圓傳送裝置100和所述傳送室230之間的傳輸效率,進而提高未沉積晶圓的沉積效率以及沉積後晶圓的存儲效率,但本發明不以此為限。Specifically, in this embodiment, the undeposited wafer can be transferred from the
具體的,在實施例中,由於所述晶圓傳送裝置100的工作壓力為常壓,所述傳送室220的工作壓力為負壓,則所述第一負載鎖定腔室和所述第二負載鎖定腔室皆可以設置朝向所述晶圓傳送裝置100中第一傳送機構120的第三門和朝向所述傳送室220的第四門,以通過所述第三門和所述第四門的開閉調節所述第一負載鎖定腔室和所述第二負載鎖定腔室內的壓力,從而使得所述第一負載鎖定腔室和所述第二負載鎖定腔室內的壓力與將要打開門的一側壓力相同,進而完成所述晶圓托盤在所述晶圓傳送裝置100和所述傳送室220之間的傳輸,但本發明不以此為限。Specifically, in the embodiment, since the working pressure of the
更具體的,所述第一負載鎖定腔室的第三門開啟時,所述第一負載鎖定腔室與所述晶圓傳送裝置100的壓力相同,所述第一傳送機構120可以將裝載未沉積晶圓的晶圓托盤從托盤台120移至所述第一負載鎖定腔室;與此同時,所述第二負載鎖定腔室的第四門開啟,使得所述第二負載鎖定腔室與所述傳送室220的壓力相同,所述傳送室220內的機器人可以將裝載沉積後晶圓的所述晶圓托盤從所述反應腔230移至所述第二負載鎖定腔室。隨後,所述第一負載鎖定腔室的第四門開啟,使得所述第一負載鎖定腔室與所述傳送室220的壓力相同,所述傳送室220內的機器人可以將裝載未沉積晶圓的所述晶圓托盤從所述第一負載鎖定腔室移至所述反應腔230;與此同時,所述第二負載鎖定腔室的第三門開啟,使得所述第二負載鎖定腔室與所述晶圓傳送裝置100的壓力相同,所述第一傳送機構120可以將裝載沉積後晶圓的所述晶圓托盤從所述第二負載鎖定腔室移至所述托盤台120,但本發明不以此為限。More specifically, when the third door of the first load lock chamber is opened, the pressure of the first load lock chamber is the same as that of the
請繼續參考圖3,所述反應腔230與對應的電氣系統250及供氣系統260連接,且三者成線性排列。Please continue to refer to FIG. 3 , the
可以理解的是,在一些其他的實施例中,所述傳送室220的橫截面為六邊形結構;其中,所述傳送室220的一個側面與托盤冷卻室240連接;所述傳送室220的兩個相鄰側面分別與所述第一負載鎖定腔室和所述第二負載鎖定腔室連接,以便於取放所述晶圓托盤;所述傳送室220的三個側面分別與三個所述反應腔230連接,且所述晶圓傳送裝置100與其中一個所述反應腔230平行設置。It can be understood that, in some other embodiments, the cross section of the
具體的,在本實施例中,由於剛完成沉積處理的所述晶圓的溫度較高,則可以通過所述傳送室220內的機器人將裝載沉積後晶圓的所述晶圓托盤放至所述托盤冷卻室240進行降溫處理,隨後再由所述傳送室220內的機器人從所述托盤冷卻室240將所述晶圓托盤移至所述負載鎖定腔室;優選地,所述托盤冷卻室240可以與所述第一負載鎖定腔室或所述第二負載鎖定腔室相對設置,但本發明不以此為限。Specifically, in this embodiment, since the temperature of the wafer that has just completed the deposition process is relatively high, the wafer tray loaded with the deposited wafer can be placed on the wafer tray by the robot in the
具體的,在本實施例中,每一所述反應腔230可以與放置於對應的電氣箱和氣體箱中的所述電氣系統250和所述供氣系統260相連,且三者整體呈直線排列(如圖3所示)。所述晶圓傳送裝置100則可以與其中一個所述反應腔230平行設置,以提高空間利用率,有效降低場地佔用面積,同時還可以降低舊設備改造難度,但本發明不以此為限。Specifically, in this embodiment, each of the
另一方面,本實施例還提供一種如上述的晶圓傳送裝置的使用方法,包括:上料操作和下料操作;其中,所述上料操作包括:步驟S11、第一傳送機構130將晶圓托盤放至托盤台120上;步驟S12、第三傳送機構150的承載臂1501將未沉積晶圓從晶圓盒組110中取出;步驟S13、所述第三傳送機構150的夾持臂1502將未沉積晶圓放入所述晶圓托盤中;步驟S14、所述第一傳送機構130將所述晶圓托盤從所述托盤台120移至負載鎖定腔室210;所述下料操作包括:步驟S21、所述第一傳送機構130將裝載沉積後晶圓的所述晶圓托盤從所述負載鎖定腔室210移至所述托盤台120;步驟S22、第二傳送機構140從所述晶圓托盤上將沉積後晶圓取出;步驟S23、所述第三傳送機構150的所述承載臂將沉積後晶圓放入所述晶圓盒組110。On the other hand, this embodiment also provides a method for using the above-mentioned wafer transfer device, including: loading operation and unloading operation; wherein, the loading operation includes: step S11, the
可以理解的是,在一些其他的實施例中,所述負載鎖定腔室210的數量為2個;所述第一傳送機構130將裝載未沉積晶圓的所述晶圓托盤放入一個所述負載鎖定腔室後,從另一個所述負載鎖定腔室取出裝載沉積後晶圓的所述晶圓托盤。It can be understood that, in some other embodiments, the number of
在一些實施例中,執行所述上料操作時,步驟S12包括:所述承載臂1501將未沉積晶圓從所述晶圓盒組110中托起並放至晶圓校準器160上;步驟S13包括:所述夾持臂1502從所述晶圓校準器160上將所述未沉積晶圓夾起並放入所述晶圓托盤中;執行所述下料操作時,步驟S22包括:所述第二傳送機構140從所述晶圓托盤上將沉積後晶圓吸起並放至所述晶圓校準器160上;步驟S23包括:所述承載臂1501從所述晶圓校準器160上將沉積後晶圓托起並放入所述晶圓盒組110。In some embodiments, when performing the loading operation, step S12 includes: the carrying
在其他的實施例中,執行所述上料操作時,步驟S13還包括:所述托盤台120帶動所述晶圓托盤旋轉,使所述晶圓托盤的每一盤坑依序停至第一預設位置與所述夾持臂1502配合放置未沉積晶圓;執行所述下料操作時,步驟S22還包括:所述托盤台120帶動所述晶圓托盤旋轉,使所述晶圓托盤的每一所述盤坑依序停至第二預設位置與所述第二傳送機構140配合取出沉積後晶圓。In other embodiments, when performing the loading operation, step S13 further includes: the tray table 120 drives the wafer tray to rotate, so that each tray pit of the wafer tray stops at the first The preset position cooperates with the
具體的,在本實施例中,使用所述晶圓傳送裝置之前還包括:將空的所述晶圓托盤通過托盤櫃170的第二門存放於所述托盤櫃170內,以使所述第一傳送機構130通過所述托盤櫃170的第一門將空的所述晶圓托盤取出並放至所述托盤台120上,但本發明不以此為限。Specifically, in this embodiment, before using the wafer transfer device, it also includes: storing the empty wafer trays in the
綜上所述,本實施例提供的一種晶圓傳送裝置、氣相沉積系統及使用方法,通過第一傳送機構、第二傳送機構及第三傳送機構中承載臂和夾持臂的配合,可以將未沉積的晶圓從晶圓盒組傳送至負載鎖定腔室以及將沉積後的晶圓從負載鎖定腔室傳送至晶圓盒組,既實現了晶圓傳輸的自動化,又避免了與未沉積的晶圓上表面被接觸污染,極大提高了晶圓的傳輸效率及晶圓上表面的潔淨度。在本實施例中,通過第三傳送機構的承載臂托舉未沉積的晶圓時,承載臂前端的貨叉與未沉積的晶圓下表面接觸;通過夾持臂夾起未沉積的晶圓時,夾持臂前端的鉗口與未沉積的晶圓的側面接觸,從而使得第三傳送機構在將晶圓從晶圓盒組移至晶圓托盤的過程中可以避免與未沉積的晶圓的上表面接觸,進而提高晶圓的上表面的潔淨度。In summary, the wafer transfer device, vapor deposition system and usage method provided in this embodiment can be Transferring undeposited wafers from the cassette stack to the load lock chamber and transferring deposited wafers from the load lock chamber to the cassette stack automates wafer transfers while avoiding the need for The upper surface of the deposited wafer is contaminated by contact, which greatly improves the transfer efficiency of the wafer and the cleanliness of the upper surface of the wafer. In this embodiment, when the undeposited wafer is lifted by the carrying arm of the third transport mechanism, the fork at the front end of the carrying arm contacts the lower surface of the undeposited wafer; the undeposited wafer is clamped by the clamping arm , the jaws at the front end of the clamping arm are in contact with the side of the undeposited wafer, so that the third transfer mechanism can avoid contact with the undeposited wafer during the process of moving the wafer from the wafer cassette group to the wafer tray. contact with the upper surface of the wafer, thereby improving the cleanliness of the upper surface of the wafer.
儘管本發明的內容已經通過上述優選實施例作了詳細介紹,但應當認識到上述的描述不應被認為是對本發明的限制。在本案所屬技術領域中具有通常知識者閱讀了上述內容後,對於本發明的多種修改和替代都將是顯而易見的。因此,本發明的保護範圍應由所附的申請專利範圍來限定。Although the content of the present invention has been described in detail through the above preferred embodiments, it should be understood that the above description should not be considered as limiting the present invention. Various modifications and alterations to the present invention will become apparent to those having ordinary skill in the art of the present invention after reading the above disclosure. Therefore, the protection scope of the present invention should be defined by the appended patent application scope.
100:晶圓傳送裝置 110:晶圓盒組 111:第一晶圓盒 112:第二晶圓盒 120:托盤台 130:第一傳送機構 140:第二傳送機構 150:第三傳送機構 1501:承載臂 1502:夾持臂 160:晶圓校準器 170:托盤櫃 210:負載鎖定腔室 220:傳送室 230:反應腔 240:托盤冷卻室 250:電氣系統 260:供氣系統 100: Wafer transfer device 110: Wafer cassette group 111:The first wafer box 112: Second wafer box 120: tray table 130: The first transmission mechanism 140: Second transmission mechanism 150: The third transmission mechanism 1501: Carrying arm 1502: clamp arm 160:Wafer Aligner 170: pallet cabinet 210: Load lock chamber 220: Teleportation Room 230: reaction chamber 240: tray cooling room 250: Electrical system 260: Air supply system
圖1是本發明一實施例提供的一種晶圓傳送裝置的結構示意圖; 圖2是本發明一實施例提供的一種晶圓傳送裝置的第三傳送機構的結構示意圖; 圖3是本發明一實施例提供的一種氣相沉積系統的結構示意圖。 FIG. 1 is a schematic structural view of a wafer transfer device provided by an embodiment of the present invention; FIG. 2 is a schematic structural view of a third transfer mechanism of a wafer transfer device according to an embodiment of the present invention; Fig. 3 is a schematic structural diagram of a vapor deposition system provided by an embodiment of the present invention.
110:晶圓盒組 110: Wafer cassette group
111:第一晶圓盒 111:The first wafer box
112:第二晶圓盒 112: Second wafer box
120:托盤台 120: tray table
130:第一傳送機構 130: The first transmission mechanism
140:第二傳送機構 140: Second transmission mechanism
150:第三傳送機構 150: The third transmission mechanism
1501:承載臂 1501: Carrying arm
1502:夾持臂 1502: clamp arm
160:晶圓校準器 160:Wafer Aligner
170:托盤櫃 170: pallet cabinet
210:負載鎖定腔室 210: Load lock chamber
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