TW202305207A - Crystal pulling furnace - Google Patents
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B27/00—Single-crystal growth under a protective fluid
- C30B27/02—Single-crystal growth under a protective fluid by pulling from a melt
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
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- C30B29/06—Silicon
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Abstract
Description
本發明屬於拉晶爐技術領域,具體關於一種拉晶爐。The invention belongs to the technical field of crystal pulling furnaces, in particular to a crystal pulling furnace.
隨著半導體矽晶圓品質的不斷提高,對拉晶過程中晶棒的晶體缺陷有了更高的管控要求,影響晶體缺陷的因素主要有兩個因素,其一是拉晶技術參數,用優化的技術參數去拉晶能製得品質更好的晶棒;其二是熱場的結構和性能,其好壞是晶棒品質的先決條件,熱場是拉晶爐中至關重要的組成部分,由於拉晶爐拉晶環境要求嚴苛,對於熱場的品質和材質要求極高,不僅要耐高溫,熱穩定性好,而且純度要高。With the continuous improvement of the quality of semiconductor silicon wafers, there are higher requirements for the control of crystal defects in crystal rods during the crystal pulling process. There are two main factors affecting crystal defects. One is the technical parameters of crystal pulling. The technical parameters of pulling the crystal can produce better quality crystal rods; the second is the structure and performance of the thermal field, which is a prerequisite for the quality of the crystal rod, and the thermal field is a crucial component of the crystal pulling furnace , due to the strict requirements on the crystal pulling environment of the crystal pulling furnace, the quality and material requirements of the thermal field are extremely high, not only high temperature resistance, good thermal stability, but also high purity.
拉晶過程中需向拉晶爐內充入惰性氣體,一是維持爐內壓力恆定,給晶體一個穩定的生長空間;二是帶走晶體生長過程中生成的大量SiO氣體及不純物,避免這些物質大量沉積在熱場部件表面,影響其正常使用。相關技術中往往因為局部溫度場的突變或惰性氣體的紊流引起晶體發生斷線,由單晶轉變成多晶生長,斷線發生後一般需要回溶或者提斷操作,這樣不僅增加了成本,而且減少了晶棒的整體良率,影響了拉晶的正常有序進行。During the crystal pulling process, it is necessary to fill the crystal pulling furnace with inert gas. One is to maintain a constant pressure in the furnace and give the crystal a stable growth space; the other is to take away a large amount of SiO gas and impurities generated during the crystal growth process to avoid these substances. A large amount is deposited on the surface of the thermal field components, affecting its normal use. In the related technology, the sudden change of the local temperature field or the turbulent flow of the inert gas often causes the crystal to break, and the single crystal is transformed into a polycrystalline growth. After the break occurs, it generally needs to be melted back or lifted, which not only increases the cost, but also increases the cost. Moreover, the overall yield rate of the ingot is reduced, which affects the normal and orderly progress of crystal pulling.
本發明實施例的目的是提供一種拉晶爐,用以解決拉晶過程中局部溫度場的突變影響拉晶的問題。The purpose of the embodiments of the present invention is to provide a crystal pulling furnace, which is used to solve the problem that sudden changes in the local temperature field affect crystal pulling during the crystal pulling process.
本發明實施例提供了一種拉晶爐,包括: 爐體,該爐體具有腔室,該爐體設有與該腔室連通的拉晶口; 支撐座,該支撐座設置於該腔室中; 坩堝,該坩堝設置於該支撐座上; 導流筒,該導流筒設置於該坩堝與該拉晶口之間; 過濾裝置,該過濾裝置設置於該導流筒的內側壁上,該過濾裝置上與該拉晶口對應的位置設有拉晶通道,該過濾裝置上設置有多個氣流通道。 An embodiment of the present invention provides a crystal pulling furnace, comprising: A furnace body, the furnace body has a chamber, and the furnace body is provided with a crystal pulling port communicated with the chamber; a support seat, the support seat is arranged in the chamber; a crucible, the crucible is arranged on the support base; A draft tube, the draft tube is arranged between the crucible and the crystal pulling port; A filtering device, the filtering device is arranged on the inner side wall of the guide cylinder, a crystal pulling channel is arranged on the filtering device corresponding to the crystal pulling port, and a plurality of air flow channels are arranged on the filtering device.
其中,該過濾裝置包括環形板,該環形板的外周與該導流筒的內側壁連接。Wherein, the filter device includes an annular plate, and the outer periphery of the annular plate is connected with the inner side wall of the guide tube.
其中,該過濾裝置包括錐筒,該氣流通道設置於該錐筒的側壁上,該拉晶通道沿該錐筒的軸線方向貫穿,該錐筒靠近該拉晶口一端的直徑小於該錐筒遠離該拉晶口一端的直徑。Wherein, the filter device includes a cone, the airflow channel is arranged on the side wall of the cone, the crystal pulling channel runs through the axis of the cone, and the diameter of the end of the cone near the crystal pulling port is smaller than that of the cone away from The diameter of one end of the crystal puller.
其中,該導流筒的內側壁設有支撐台,該過濾裝置的底部設置於該支撐臺上。Wherein, the inner side wall of the guide tube is provided with a supporting platform, and the bottom of the filtering device is arranged on the supporting platform.
其中,該過濾裝置在第一平面上的正投影位於該坩堝在該第一平面上的正投影內,該第一平面與該爐體的軸線垂直。Wherein, the orthographic projection of the filtering device on the first plane is located within the orthographic projection of the crucible on the first plane, and the first plane is perpendicular to the axis of the furnace body.
其中,該導流筒在第一平面上的正投影位於該坩堝在該第一平面上的正投影內,該第一平面與該爐體的軸線垂直。Wherein, the orthographic projection of the draft tube on the first plane is located within the orthographic projection of the crucible on the first plane, and the first plane is perpendicular to the axis of the furnace body.
其中,該腔室的內側壁設有導流板,該導流板沿該腔室的內側壁的周向延伸,該導流板設置於該導流筒的外側,該導流筒與該導流板連接。Wherein, the inner wall of the chamber is provided with a deflector, and the deflector extends along the circumferential direction of the inner wall of the chamber, and the deflector is arranged on the outer side of the guide tube, and the guide tube and the guide tube Flow plate connection.
其中,該導流板和該導流筒中至少一個為保溫材料件;和/或 該導流板和該導流筒中至少一個的表面設有保溫層。 Wherein, at least one of the deflector and the deflector is a piece of thermal insulation material; and/or The surface of at least one of the deflector and the deflector is provided with an insulating layer.
其中,該氣流通道包括第一通道和與該第一通道連通的第二通道,該第一通道遠離該坩堝設置,該第二通道靠近該坩堝設置,該第一通道的直徑大於該第二通道的直徑。Wherein, the gas flow channel includes a first channel and a second channel communicated with the first channel, the first channel is set away from the crucible, the second channel is set close to the crucible, the diameter of the first channel is larger than that of the second channel diameter of.
其中,該氣流通道的數量為多個,多個該氣流通道均勻分佈在該過濾裝置上;和/或 該導流筒的軸線與該爐體的軸線共線或平行;和/或 該拉晶通道的軸線與該爐體的軸線共線或平行。 Wherein, the number of the airflow channel is multiple, and a plurality of the airflow channels are evenly distributed on the filter device; and/or The axis of the draft tube is collinear or parallel to the axis of the furnace body; and/or The axis of the crystal pulling channel is collinear or parallel to the axis of the furnace body.
本發明實施例的拉晶爐,包括:爐體,該爐體具有腔室,該爐體設有與該腔室連通的拉晶口;支撐座,該支撐座設置於該腔室中;坩堝,該坩堝設置於該支撐座上;導流筒,該導流筒設置於該坩堝與該拉晶口之間;過濾裝置,該過濾裝置設置於該導流筒的內側壁上,該過濾裝置上與該拉晶口對應的位置設有拉晶通道,該過濾裝置上設置有多個氣流通道。The crystal pulling furnace according to the embodiment of the present invention includes: a furnace body, the furnace body has a chamber, and the furnace body is provided with a crystal pulling port communicated with the chamber; a support seat, the support seat is arranged in the chamber; a crucible , the crucible is arranged on the support base; the guide cylinder, the guide cylinder is arranged between the crucible and the crystal pulling port; the filter device, the filter device is arranged on the inner wall of the guide cylinder, the filter device A crystal pulling channel is provided at a position corresponding to the crystal pulling port, and a plurality of airflow channels are provided on the filtering device.
在本發明實施例的拉晶爐中,過濾裝置設置於該導流筒的內側壁上,該過濾裝置上與該拉晶口對應的位置設有拉晶通道,該過濾裝置上設置有多個氣流通道。通過過濾裝置可以過濾矽熔體與石英坩堝反應生成的氧化矽在拉晶爐上方的凝結物以及拉晶爐上方的其他顆粒物體或惰性氣體流中的其他不純物,防止較冷物質跌落到晶體生長的固液交界面附近,防止較冷物質帶來熱衝擊,避免局部溫度的震盪。在拉晶過程中,過濾裝置可以阻隔生成的氧化矽氣體向上漂浮,惰性氣體由上方向下流動,經過過濾裝置後可以過濾掉存在固體雜質顆粒,同時過濾裝置的氣流通道可以改變惰性氣體紊流,使通過的氣流有序掠過熔體表面,及時帶走氧化矽氣體,通過過濾裝置可以有效阻止熱衝擊的產生,減少惰性氣體的紊流,大大減少晶棒斷線的機率,提高晶棒的整體良率。In the crystal pulling furnace of the embodiment of the present invention, the filter device is arranged on the inner wall of the guide cylinder, and the position corresponding to the crystal pulling port on the filter device is provided with a crystal pulling channel, and the filter device is provided with a plurality of Airflow channel. The silicon oxide formed by the reaction between the silicon melt and the quartz crucible can be filtered through the filter device, and the condensation of silicon oxide above the crystal pulling furnace and other particulate objects above the crystal pulling furnace or other impurities in the inert gas flow can be filtered to prevent colder substances from falling into the crystal growth. Near the solid-liquid interface of the solid-liquid interface, prevent the thermal shock caused by the colder substance and avoid local temperature fluctuations. During the crystal pulling process, the filter device can block the generated silicon oxide gas from floating upward, and the inert gas flows from the top to the bottom. After passing through the filter device, the solid impurity particles can be filtered out. At the same time, the air flow channel of the filter device can change the turbulent flow of the inert gas. , so that the passing airflow passes over the surface of the melt in an orderly manner, and the silicon oxide gas is taken away in time. The filter device can effectively prevent the generation of thermal shock, reduce the turbulent flow of inert gas, greatly reduce the probability of crystal ingot disconnection, and improve the crystal ingot overall yield.
為了使本發明的目的、技術方案及優點更加清楚明白,下面結合附圖及實施例,對本發明進行進一步詳細說明。應當理解,此處所描述的具體實施例僅用以解釋本發明,但並不用於限定本發明。In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, but not to limit the present invention.
需要說明的是,當元件被稱為“固定於”或“設置於”另一個元件,它可以直接在另一個元件上或者間接在所述另一個元件上。當一個元件被稱為是“連接於”另一個元件,它可以是直接連接到另一個元件或間接連接至所述另一個元件上。It should be noted that when an element is referred to as being “fixed” or “disposed on” another element, it may be directly on the other element or indirectly on the other element. When an element is referred to as being "connected to" another element, it can be directly connected to the other element or indirectly connected to the other element.
需要理解的是,術語“長度”、“寬度”、“上”、“下”、“前”、“後”、“左”、“右”、“垂直”、“水平”、“頂”、“底”、“內”、“外”等指示的方位或位置關係為基於附圖所示的方位或位置關係,僅是為了便於描述本發明和簡化描述,而不是指示或暗示所指的裝置或元件必須具有特定的方位、以特定的方位構造和操作,因此不能理解為對本發明的限制。It is to be understood that the terms "length", "width", "top", "bottom", "front", "rear", "left", "right", "vertical", "horizontal", "top", The orientation or positional relationship indicated by "bottom", "inner", "outer", etc. is based on the orientation or positional relationship shown in the drawings, and is only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying the referred device Or elements must have a certain orientation, be constructed and operate in a certain orientation, and thus should not be construed as limiting the invention.
此外,術語“第一”、“第二”僅用於描述目的,而不能理解為指示或暗示相對重要性或者隱含指明所指示的技術特徵的數量。由此,限定有“第一”、“第二”的特徵可以明示或者隱含地包括一個或者更多個所述特徵。在本發明的描述中,“多個”的含義是兩個或兩個以上,除非另有明確具體的限定。In addition, the terms "first" and "second" are used for descriptive purposes only, and cannot be interpreted as indicating or implying relative importance or implicitly specifying the quantity of indicated technical features. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of said features. In the description of the present invention, "plurality" means two or more, unless otherwise specifically defined.
在本發明中,除非另有明確的規定和限定,術語“安裝”、“相連”、“連接”、“固定”等術語應做廣義理解,例如,可以是固定連接,也可以是可拆卸連接,或成一體;可以是機械連接,也可以是電連接;可以是直接相連,也可以通過中間媒介間接相連,可以是兩個元件內部的連通或兩個元件的相互作用關係。對於本領域的具有通常知識者而言,可以根據具體情況理解上述術語在本發明中的具體含義。In the present invention, unless otherwise clearly specified and limited, terms such as "installation", "connection", "connection" and "fixation" should be understood in a broad sense, for example, it can be a fixed connection or a detachable connection , or integrated; it can be mechanically connected or electrically connected; it can be directly connected or indirectly connected through an intermediary, and it can be the internal communication of two components or the interaction relationship between two components. Those with ordinary knowledge in the art can understand the specific meanings of the above terms in the present invention according to specific situations.
下面結合附圖1至圖4所示,通過具體的實施例及其應用場景對本申請實施例提供的拉晶爐進行詳細地說明。The crystal pulling furnace provided by the embodiment of the present application will be described in detail below through specific embodiments and application scenarios as shown in FIG. 1 to FIG. 4 .
如圖1至圖4所示,本發明實施例的拉晶爐包括:爐體10、支撐座20、坩堝30、導流筒40與過濾裝置50,爐體10具有腔室11,爐體10設有與腔室11連通的拉晶口12,可以通過拉晶口12進行拉晶。支撐座20設置於腔室11中,支撐座20可以包括支撐桿與基座,支撐桿的下端與腔室的內底壁連接,基座可以設置於支撐桿的上端,支撐桿的軸線可以與爐體的軸線平行或重合。坩堝30設置於支撐座20上,坩堝30可以設置於基座上,支撐桿可以轉動,通過支撐桿的轉動可以帶動坩堝30轉動,可以使得坩堝30受熱均勻。導流筒40可以設置於坩堝30與拉晶口12之間,通過導流筒40可以堵起立進行導流,可以使得氣流流動到坩堝30的矽熔體33上,以便帶動產生的氧化物。坩堝30可以包括石墨坩堝31與石英坩堝32,石墨坩堝31可以設置於支撐座20上,石英坩堝32可以設置於石墨坩堝31內。As shown in FIGS. 1 to 4 , the crystal pulling furnace of the embodiment of the present invention includes: a
過濾裝置50可以設置於導流筒40的內側壁上,過濾裝置50可以設置於導流筒40的下端位置,過濾裝置50上與拉晶口12對應的位置可以設有拉晶通道,拉晶通道可以為圓形,通過拉晶通道可以便於拉晶,便於晶棒60通過。過濾裝置50上可以設置有多個氣流通道53,多個氣流通道53可以間隔設置。過濾裝置50的數量可以為一個或多個,比如,過濾裝置50的數量為多個,多個過濾裝置50可以沿導流筒40的軸線方向間隔設置,增強過濾以及導流效果。The
在本發明實施例的拉晶爐中,過濾裝置50設置於導流筒40的內側壁上,過濾裝置50上與拉晶口12對應的位置設有拉晶通道,過濾裝置50上設置有多個氣流通道53。通過過濾裝置50可以過濾矽熔體與石英坩堝反應生成的氧化矽在拉晶爐上方的凝結物以及拉晶爐上方的其他顆粒物體或惰性氣體流中的其他不純物,防止較冷物質跌落到晶體生長的固液交界面附近,防止較冷物質帶來熱衝擊,避免局部溫度的震盪。在拉晶過程中,過濾裝置50可以阻隔生成的氧化矽氣體向上漂浮,惰性氣體由上方向下流動,經過過濾裝置50後可以過濾掉存在固體雜質顆粒,同時過濾裝置50的氣流通道53可以改變惰性氣體紊流,使通過的氣流有序掠過熔體表面,及時帶走氧化矽氣體,通過過濾裝置50可以有效阻止熱衝擊的產生,減少惰性氣體的紊流,大大減少晶棒斷線的機率,提高晶棒的整體良率。In the crystal pulling furnace of the embodiment of the present invention, the
在一些實施例中,如圖1所示,過濾裝置50可以包括環形板,環形板的外周與導流筒40的內側壁連接,環形板的軸線可以與爐體10的軸線平行或重合。多個氣流通道53可以間隔設置在環形板上,環形板中部的圓形孔作為拉晶通道。經過環形板後可以過濾掉存在固體雜質顆粒,同時環形板的氣流通道53可以改變惰性氣體紊流,使通過的氣流有序掠過熔體表面,及時帶走氧化矽氣體,通過環形板可以有效阻止熱衝擊的產生,減少惰性氣體的紊流。In some embodiments, as shown in FIG. 1 , the
在另一些實施例中,如圖3至圖4所示,過濾裝置50可以包括錐筒,氣流通道53設置於錐筒的側壁上,拉晶通道沿錐筒的軸線方向貫穿,錐筒靠近拉晶口12一端的直徑小於錐筒遠離拉晶口12一端的直徑,便於通過氣流通道53過濾固體雜質顆粒,使得氣流通道53可以改變惰性氣體紊流。錐筒的側壁具有一定傾斜角度,可以改變惰性氣體流的方向,使之均勻地吹向晶棒表面,加快晶棒冷卻,提高拉晶速率。在顆粒被阻擋後,顆粒可以沿著錐筒的外側壁向下移動,減少對於氣流通道53的阻塞。In some other embodiments, as shown in FIGS. 3 to 4 , the
可選地,如圖1至圖4所示,導流筒40的內側壁可以設有支撐台41,支撐台41可以沿著導流筒40的內側壁的周向延伸,過濾裝置50的底部設置於支撐台41上,通過支撐台41可以支撐過濾裝置50。過濾裝置50的底部與支撐台41的上表面之間可以設置密封結構,減小間隙,防止固體雜質或氣流從間隙中通過。錐筒的底部邊沿可以設置於支撐台41上,錐筒的外側壁與導流筒40的內側壁可以間隔設置,錐筒的軸線與爐體10的軸線可以平行或重合。Optionally, as shown in FIGS. 1 to 4 , a
支撐台41上位於導流筒40的內側壁與錐筒的外側壁之間的區域可以設有凹槽,在顆粒被阻擋後,顆粒可以沿著錐筒的外側壁向下移動,通過凹槽可以容納收集固體顆粒,減少對於氣流通道53的阻塞。The area between the inner side wall of the
可選地,過濾裝置50在第一平面上的正投影可以位於坩堝30在第一平面上的正投影內,第一平面與爐體10的軸線垂直,防止固體雜質顆粒進入坩堝30中的熔體,使得通過氣流通道53的氣體可以有序掠過熔體表面,及時帶走氧化矽氣體,有效阻止熱衝擊的產生。Optionally, the orthographic projection of the
可選地,導流筒40在第一平面上的正投影位於坩堝30在第一平面上的正投影內,第一平面與爐體10的軸線垂直,使得導流後的氣體可以有序掠過熔體表面,及時帶走氧化矽氣體。Optionally, the orthographic projection of the
在一些實施例中,腔室11的內側壁可以設有導流板42,導流板42可以沿腔室11的內側壁的周向延伸,導流板42可以設置於導流筒40的外側,導流筒40與導流板42可以連接。使得通過氣流通道53的氣體有序掠過熔體表面後,通過導流板42的導流使得帶有氧化物的氣體可以沿著爐體10的內側壁向爐體10的底部流動,以便帶走氧化物,減少氧化物對於坩堝30、支撐座20以及其他部件的損傷或影響。In some embodiments, the inner wall of the
在本發明的實施例中,導流板42和導流筒40中至少一個可以為保溫材料件,比如,導流板42或導流筒40可以為保溫材料件,導流板42和導流筒40均可以為保溫材料件,提高保溫效果,減少熱損失。In an embodiment of the present invention, at least one of the
導流板42和導流筒40中至少一個的表面可以設有保溫層,比如,導流板42或導流筒40的表面可以設有保溫層,導流板42和導流筒40的表面均設有保溫層,通過保溫層可以提高保溫效果,減少熱損失。The surface of at least one of the
可選地,如圖2所示,氣流通道53可以包括第一通道51和與第一通道51連通的第二通道52,第一通道51遠離坩堝30設置,第二通道52靠近坩堝30設置,第一通道51的直徑大於第二通道52的直徑,便於通過氣流通道53過濾固體雜質顆粒,使得氣流通道53可以改變惰性氣體紊流。Optionally, as shown in FIG. 2 , the
可選地,氣流通道53的數量為多個,多個氣流通道53可以均勻分佈在過濾裝置50上,使得氣流通道53可以改變惰性氣體紊流,氣流分佈均勻。Optionally, the number of
可選地,導流筒40的軸線與爐體10的軸線共線或平行,拉晶通道的軸線與爐體10的軸線共線或平行,使得導流筒、拉晶通道位於爐體10的中心位置,有利於爐體10氣流以及溫度的均勻分佈。Optionally, the axis of the
上面結合附圖對本發明的實施例進行了描述,但是本發明並不局限於上述的具體實施方式,上述的具體實施方式僅僅是示意性的,而不是限制性的,本領域的具有通常知識者在本發明的啟示下,在不脫離本發明宗旨和申請專利範圍所保護的範圍情況下,還可做出很多形式,均屬於本發明的保護之內。Embodiments of the present invention have been described above in conjunction with the accompanying drawings, but the present invention is not limited to the above-mentioned specific implementations, and the above-mentioned specific implementations are only illustrative, rather than restrictive, and those with ordinary knowledge in the art Under the enlightenment of the present invention, without departing from the purpose of the present invention and the scope protected by the scope of the patent application, many forms can also be made, all of which belong to the protection of the present invention.
10:爐體 11:腔室 12:拉晶口 20:支撐座 30:坩堝 31:石墨坩堝 32:石英坩堝 33:矽熔體 40:導流筒 41:支撐台 42:導流板 50:過濾裝置 51:第一通道 52:第二通道 53:氣流通道 60:晶棒 10: furnace body 11: chamber 12: Crystal port 20: Support seat 30: Crucible 31: graphite crucible 32: Quartz crucible 33: Silicon melt 40: deflector 41: support platform 42: deflector 50: Filtration device 51: The first channel 52:Second channel 53: Airflow channel 60: Ingot
圖1為拉晶爐的一個結構示意圖; 圖2為氣流通道的一個分佈示意圖; 圖3為過濾裝置設置於支撐臺上的一個局部示意圖; 圖4為過濾裝置設置於支撐臺上的一個示意圖。 Fig. 1 is a structural representation of crystal pulling furnace; Fig. 2 is a schematic diagram of the distribution of air passages; Fig. 3 is a partial schematic diagram of the filtering device being arranged on the supporting platform; Fig. 4 is a schematic diagram of a filter device disposed on a support platform.
10:爐體 10: furnace body
11:腔室 11: chamber
12:拉晶口 12: Crystal port
20:支撐座 20: Support seat
30:坩堝 30: Crucible
31:石墨坩堝 31: graphite crucible
32:石英坩堝 32: Quartz crucible
33:矽熔體 33: Silicon melt
40:導流筒 40: deflector
41:支撐台 41: support table
42:導流板 42: deflector
50:過濾裝置 50: Filtration device
60:晶棒 60: Ingot
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EP0191111B1 (en) * | 1984-12-28 | 1991-09-18 | International Business Machines Corporation | Improvements to pulling processes and equipment for growing silicon crystals having high and controlled carbon content |
JP2504875B2 (en) * | 1991-06-18 | 1996-06-05 | コマツ電子金属株式会社 | Single crystal manufacturing equipment |
JP2827789B2 (en) * | 1993-02-23 | 1998-11-25 | 信越半導体株式会社 | Inert gas straightening and spraying equipment for single crystal pulling equipment |
US8152921B2 (en) * | 2006-09-01 | 2012-04-10 | Okmetic Oyj | Crystal manufacturing |
KR101044124B1 (en) * | 2008-11-21 | 2011-06-28 | 주식회사 엘지실트론 | Cleaning method and cleaning module for manufacturing apparatus for crystal ingot |
KR20110000174A (en) * | 2009-06-26 | 2011-01-03 | 네오세미테크 주식회사 | The ar gsa flow filtering machine |
RU2472875C1 (en) * | 2011-08-24 | 2013-01-20 | Общество с ограниченной ответственностью "Макси-М" | Method for growing silicon monocrystal from molten metal |
WO2014197672A1 (en) * | 2013-06-05 | 2014-12-11 | Sunedison, Inc. | Insitu sneeze valve for clearing exhaust of a czochralski growth chamber |
KR101528055B1 (en) * | 2013-11-25 | 2015-06-11 | 주식회사 엘지실트론 | Ingot growing apparatus |
KR20150106204A (en) * | 2014-03-11 | 2015-09-21 | (주)기술과가치 | Apparatus for manufacturing ingot |
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CN111519241B (en) * | 2019-02-01 | 2021-12-17 | 上海新昇半导体科技有限公司 | Semiconductor crystal growth device |
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