TW202305207A - Crystal pulling furnace - Google Patents

Crystal pulling furnace Download PDF

Info

Publication number
TW202305207A
TW202305207A TW111139988A TW111139988A TW202305207A TW 202305207 A TW202305207 A TW 202305207A TW 111139988 A TW111139988 A TW 111139988A TW 111139988 A TW111139988 A TW 111139988A TW 202305207 A TW202305207 A TW 202305207A
Authority
TW
Taiwan
Prior art keywords
crystal pulling
channel
furnace
crucible
deflector
Prior art date
Application number
TW111139988A
Other languages
Chinese (zh)
Other versions
TWI812518B (en
Inventor
楊文武
Original Assignee
大陸商西安奕斯偉材料科技有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 大陸商西安奕斯偉材料科技有限公司 filed Critical 大陸商西安奕斯偉材料科技有限公司
Publication of TW202305207A publication Critical patent/TW202305207A/en
Application granted granted Critical
Publication of TWI812518B publication Critical patent/TWI812518B/en

Links

Images

Classifications

    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B27/00Single-crystal growth under a protective fluid
    • C30B27/02Single-crystal growth under a protective fluid by pulling from a melt
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B29/00Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
    • C30B29/02Elements
    • C30B29/06Silicon

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
  • Saccharide Compounds (AREA)

Abstract

The invention discloses a crystal pulling furnace which comprises a furnace body provided with a cavity and a crystal pulling opening communicated with the cavity. The supporting seat is arranged in the cavity; the crucible is arranged on the supporting seat; the guide cylinder is arranged between the crucible and the crystal pulling opening; the filtering device is arranged on the inner side wall of the guide cylinder, a crystal pulling channel is formed in the position, corresponding to the crystal pulling opening, of the filtering device, and a plurality of airflow channels are formed in the filtering device.

Description

拉晶爐Crystal puller

本發明屬於拉晶爐技術領域,具體關於一種拉晶爐。The invention belongs to the technical field of crystal pulling furnaces, in particular to a crystal pulling furnace.

隨著半導體矽晶圓品質的不斷提高,對拉晶過程中晶棒的晶體缺陷有了更高的管控要求,影響晶體缺陷的因素主要有兩個因素,其一是拉晶技術參數,用優化的技術參數去拉晶能製得品質更好的晶棒;其二是熱場的結構和性能,其好壞是晶棒品質的先決條件,熱場是拉晶爐中至關重要的組成部分,由於拉晶爐拉晶環境要求嚴苛,對於熱場的品質和材質要求極高,不僅要耐高溫,熱穩定性好,而且純度要高。With the continuous improvement of the quality of semiconductor silicon wafers, there are higher requirements for the control of crystal defects in crystal rods during the crystal pulling process. There are two main factors affecting crystal defects. One is the technical parameters of crystal pulling. The technical parameters of pulling the crystal can produce better quality crystal rods; the second is the structure and performance of the thermal field, which is a prerequisite for the quality of the crystal rod, and the thermal field is a crucial component of the crystal pulling furnace , due to the strict requirements on the crystal pulling environment of the crystal pulling furnace, the quality and material requirements of the thermal field are extremely high, not only high temperature resistance, good thermal stability, but also high purity.

拉晶過程中需向拉晶爐內充入惰性氣體,一是維持爐內壓力恆定,給晶體一個穩定的生長空間;二是帶走晶體生長過程中生成的大量SiO氣體及不純物,避免這些物質大量沉積在熱場部件表面,影響其正常使用。相關技術中往往因為局部溫度場的突變或惰性氣體的紊流引起晶體發生斷線,由單晶轉變成多晶生長,斷線發生後一般需要回溶或者提斷操作,這樣不僅增加了成本,而且減少了晶棒的整體良率,影響了拉晶的正常有序進行。During the crystal pulling process, it is necessary to fill the crystal pulling furnace with inert gas. One is to maintain a constant pressure in the furnace and give the crystal a stable growth space; the other is to take away a large amount of SiO gas and impurities generated during the crystal growth process to avoid these substances. A large amount is deposited on the surface of the thermal field components, affecting its normal use. In the related technology, the sudden change of the local temperature field or the turbulent flow of the inert gas often causes the crystal to break, and the single crystal is transformed into a polycrystalline growth. After the break occurs, it generally needs to be melted back or lifted, which not only increases the cost, but also increases the cost. Moreover, the overall yield rate of the ingot is reduced, which affects the normal and orderly progress of crystal pulling.

本發明實施例的目的是提供一種拉晶爐,用以解決拉晶過程中局部溫度場的突變影響拉晶的問題。The purpose of the embodiments of the present invention is to provide a crystal pulling furnace, which is used to solve the problem that sudden changes in the local temperature field affect crystal pulling during the crystal pulling process.

本發明實施例提供了一種拉晶爐,包括: 爐體,該爐體具有腔室,該爐體設有與該腔室連通的拉晶口; 支撐座,該支撐座設置於該腔室中; 坩堝,該坩堝設置於該支撐座上; 導流筒,該導流筒設置於該坩堝與該拉晶口之間; 過濾裝置,該過濾裝置設置於該導流筒的內側壁上,該過濾裝置上與該拉晶口對應的位置設有拉晶通道,該過濾裝置上設置有多個氣流通道。 An embodiment of the present invention provides a crystal pulling furnace, comprising: A furnace body, the furnace body has a chamber, and the furnace body is provided with a crystal pulling port communicated with the chamber; a support seat, the support seat is arranged in the chamber; a crucible, the crucible is arranged on the support base; A draft tube, the draft tube is arranged between the crucible and the crystal pulling port; A filtering device, the filtering device is arranged on the inner side wall of the guide cylinder, a crystal pulling channel is arranged on the filtering device corresponding to the crystal pulling port, and a plurality of air flow channels are arranged on the filtering device.

其中,該過濾裝置包括環形板,該環形板的外周與該導流筒的內側壁連接。Wherein, the filter device includes an annular plate, and the outer periphery of the annular plate is connected with the inner side wall of the guide tube.

其中,該過濾裝置包括錐筒,該氣流通道設置於該錐筒的側壁上,該拉晶通道沿該錐筒的軸線方向貫穿,該錐筒靠近該拉晶口一端的直徑小於該錐筒遠離該拉晶口一端的直徑。Wherein, the filter device includes a cone, the airflow channel is arranged on the side wall of the cone, the crystal pulling channel runs through the axis of the cone, and the diameter of the end of the cone near the crystal pulling port is smaller than that of the cone away from The diameter of one end of the crystal puller.

其中,該導流筒的內側壁設有支撐台,該過濾裝置的底部設置於該支撐臺上。Wherein, the inner side wall of the guide tube is provided with a supporting platform, and the bottom of the filtering device is arranged on the supporting platform.

其中,該過濾裝置在第一平面上的正投影位於該坩堝在該第一平面上的正投影內,該第一平面與該爐體的軸線垂直。Wherein, the orthographic projection of the filtering device on the first plane is located within the orthographic projection of the crucible on the first plane, and the first plane is perpendicular to the axis of the furnace body.

其中,該導流筒在第一平面上的正投影位於該坩堝在該第一平面上的正投影內,該第一平面與該爐體的軸線垂直。Wherein, the orthographic projection of the draft tube on the first plane is located within the orthographic projection of the crucible on the first plane, and the first plane is perpendicular to the axis of the furnace body.

其中,該腔室的內側壁設有導流板,該導流板沿該腔室的內側壁的周向延伸,該導流板設置於該導流筒的外側,該導流筒與該導流板連接。Wherein, the inner wall of the chamber is provided with a deflector, and the deflector extends along the circumferential direction of the inner wall of the chamber, and the deflector is arranged on the outer side of the guide tube, and the guide tube and the guide tube Flow plate connection.

其中,該導流板和該導流筒中至少一個為保溫材料件;和/或 該導流板和該導流筒中至少一個的表面設有保溫層。 Wherein, at least one of the deflector and the deflector is a piece of thermal insulation material; and/or The surface of at least one of the deflector and the deflector is provided with an insulating layer.

其中,該氣流通道包括第一通道和與該第一通道連通的第二通道,該第一通道遠離該坩堝設置,該第二通道靠近該坩堝設置,該第一通道的直徑大於該第二通道的直徑。Wherein, the gas flow channel includes a first channel and a second channel communicated with the first channel, the first channel is set away from the crucible, the second channel is set close to the crucible, the diameter of the first channel is larger than that of the second channel diameter of.

其中,該氣流通道的數量為多個,多個該氣流通道均勻分佈在該過濾裝置上;和/或 該導流筒的軸線與該爐體的軸線共線或平行;和/或 該拉晶通道的軸線與該爐體的軸線共線或平行。 Wherein, the number of the airflow channel is multiple, and a plurality of the airflow channels are evenly distributed on the filter device; and/or The axis of the draft tube is collinear or parallel to the axis of the furnace body; and/or The axis of the crystal pulling channel is collinear or parallel to the axis of the furnace body.

本發明實施例的拉晶爐,包括:爐體,該爐體具有腔室,該爐體設有與該腔室連通的拉晶口;支撐座,該支撐座設置於該腔室中;坩堝,該坩堝設置於該支撐座上;導流筒,該導流筒設置於該坩堝與該拉晶口之間;過濾裝置,該過濾裝置設置於該導流筒的內側壁上,該過濾裝置上與該拉晶口對應的位置設有拉晶通道,該過濾裝置上設置有多個氣流通道。The crystal pulling furnace according to the embodiment of the present invention includes: a furnace body, the furnace body has a chamber, and the furnace body is provided with a crystal pulling port communicated with the chamber; a support seat, the support seat is arranged in the chamber; a crucible , the crucible is arranged on the support base; the guide cylinder, the guide cylinder is arranged between the crucible and the crystal pulling port; the filter device, the filter device is arranged on the inner wall of the guide cylinder, the filter device A crystal pulling channel is provided at a position corresponding to the crystal pulling port, and a plurality of airflow channels are provided on the filtering device.

在本發明實施例的拉晶爐中,過濾裝置設置於該導流筒的內側壁上,該過濾裝置上與該拉晶口對應的位置設有拉晶通道,該過濾裝置上設置有多個氣流通道。通過過濾裝置可以過濾矽熔體與石英坩堝反應生成的氧化矽在拉晶爐上方的凝結物以及拉晶爐上方的其他顆粒物體或惰性氣體流中的其他不純物,防止較冷物質跌落到晶體生長的固液交界面附近,防止較冷物質帶來熱衝擊,避免局部溫度的震盪。在拉晶過程中,過濾裝置可以阻隔生成的氧化矽氣體向上漂浮,惰性氣體由上方向下流動,經過過濾裝置後可以過濾掉存在固體雜質顆粒,同時過濾裝置的氣流通道可以改變惰性氣體紊流,使通過的氣流有序掠過熔體表面,及時帶走氧化矽氣體,通過過濾裝置可以有效阻止熱衝擊的產生,減少惰性氣體的紊流,大大減少晶棒斷線的機率,提高晶棒的整體良率。In the crystal pulling furnace of the embodiment of the present invention, the filter device is arranged on the inner wall of the guide cylinder, and the position corresponding to the crystal pulling port on the filter device is provided with a crystal pulling channel, and the filter device is provided with a plurality of Airflow channel. The silicon oxide formed by the reaction between the silicon melt and the quartz crucible can be filtered through the filter device, and the condensation of silicon oxide above the crystal pulling furnace and other particulate objects above the crystal pulling furnace or other impurities in the inert gas flow can be filtered to prevent colder substances from falling into the crystal growth. Near the solid-liquid interface of the solid-liquid interface, prevent the thermal shock caused by the colder substance and avoid local temperature fluctuations. During the crystal pulling process, the filter device can block the generated silicon oxide gas from floating upward, and the inert gas flows from the top to the bottom. After passing through the filter device, the solid impurity particles can be filtered out. At the same time, the air flow channel of the filter device can change the turbulent flow of the inert gas. , so that the passing airflow passes over the surface of the melt in an orderly manner, and the silicon oxide gas is taken away in time. The filter device can effectively prevent the generation of thermal shock, reduce the turbulent flow of inert gas, greatly reduce the probability of crystal ingot disconnection, and improve the crystal ingot overall yield.

為了使本發明的目的、技術方案及優點更加清楚明白,下面結合附圖及實施例,對本發明進行進一步詳細說明。應當理解,此處所描述的具體實施例僅用以解釋本發明,但並不用於限定本發明。In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, but not to limit the present invention.

需要說明的是,當元件被稱為“固定於”或“設置於”另一個元件,它可以直接在另一個元件上或者間接在所述另一個元件上。當一個元件被稱為是“連接於”另一個元件,它可以是直接連接到另一個元件或間接連接至所述另一個元件上。It should be noted that when an element is referred to as being “fixed” or “disposed on” another element, it may be directly on the other element or indirectly on the other element. When an element is referred to as being "connected to" another element, it can be directly connected to the other element or indirectly connected to the other element.

需要理解的是,術語“長度”、“寬度”、“上”、“下”、“前”、“後”、“左”、“右”、“垂直”、“水平”、“頂”、“底”、“內”、“外”等指示的方位或位置關係為基於附圖所示的方位或位置關係,僅是為了便於描述本發明和簡化描述,而不是指示或暗示所指的裝置或元件必須具有特定的方位、以特定的方位構造和操作,因此不能理解為對本發明的限制。It is to be understood that the terms "length", "width", "top", "bottom", "front", "rear", "left", "right", "vertical", "horizontal", "top", The orientation or positional relationship indicated by "bottom", "inner", "outer", etc. is based on the orientation or positional relationship shown in the drawings, and is only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying the referred device Or elements must have a certain orientation, be constructed and operate in a certain orientation, and thus should not be construed as limiting the invention.

此外,術語“第一”、“第二”僅用於描述目的,而不能理解為指示或暗示相對重要性或者隱含指明所指示的技術特徵的數量。由此,限定有“第一”、“第二”的特徵可以明示或者隱含地包括一個或者更多個所述特徵。在本發明的描述中,“多個”的含義是兩個或兩個以上,除非另有明確具體的限定。In addition, the terms "first" and "second" are used for descriptive purposes only, and cannot be interpreted as indicating or implying relative importance or implicitly specifying the quantity of indicated technical features. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of said features. In the description of the present invention, "plurality" means two or more, unless otherwise specifically defined.

在本發明中,除非另有明確的規定和限定,術語“安裝”、“相連”、“連接”、“固定”等術語應做廣義理解,例如,可以是固定連接,也可以是可拆卸連接,或成一體;可以是機械連接,也可以是電連接;可以是直接相連,也可以通過中間媒介間接相連,可以是兩個元件內部的連通或兩個元件的相互作用關係。對於本領域的具有通常知識者而言,可以根據具體情況理解上述術語在本發明中的具體含義。In the present invention, unless otherwise clearly specified and limited, terms such as "installation", "connection", "connection" and "fixation" should be understood in a broad sense, for example, it can be a fixed connection or a detachable connection , or integrated; it can be mechanically connected or electrically connected; it can be directly connected or indirectly connected through an intermediary, and it can be the internal communication of two components or the interaction relationship between two components. Those with ordinary knowledge in the art can understand the specific meanings of the above terms in the present invention according to specific situations.

下面結合附圖1至圖4所示,通過具體的實施例及其應用場景對本申請實施例提供的拉晶爐進行詳細地說明。The crystal pulling furnace provided by the embodiment of the present application will be described in detail below through specific embodiments and application scenarios as shown in FIG. 1 to FIG. 4 .

如圖1至圖4所示,本發明實施例的拉晶爐包括:爐體10、支撐座20、坩堝30、導流筒40與過濾裝置50,爐體10具有腔室11,爐體10設有與腔室11連通的拉晶口12,可以通過拉晶口12進行拉晶。支撐座20設置於腔室11中,支撐座20可以包括支撐桿與基座,支撐桿的下端與腔室的內底壁連接,基座可以設置於支撐桿的上端,支撐桿的軸線可以與爐體的軸線平行或重合。坩堝30設置於支撐座20上,坩堝30可以設置於基座上,支撐桿可以轉動,通過支撐桿的轉動可以帶動坩堝30轉動,可以使得坩堝30受熱均勻。導流筒40可以設置於坩堝30與拉晶口12之間,通過導流筒40可以堵起立進行導流,可以使得氣流流動到坩堝30的矽熔體33上,以便帶動產生的氧化物。坩堝30可以包括石墨坩堝31與石英坩堝32,石墨坩堝31可以設置於支撐座20上,石英坩堝32可以設置於石墨坩堝31內。As shown in FIGS. 1 to 4 , the crystal pulling furnace of the embodiment of the present invention includes: a furnace body 10 , a support base 20 , a crucible 30 , a draft tube 40 and a filtering device 50 , the furnace body 10 has a chamber 11 , and the furnace body 10 A crystal pulling port 12 communicating with the chamber 11 is provided, and crystal pulling can be performed through the crystal pulling port 12 . The support seat 20 is arranged in the chamber 11, the support seat 20 can include a support rod and a base, the lower end of the support rod is connected to the inner bottom wall of the chamber, the base can be arranged on the upper end of the support rod, and the axis of the support rod can be aligned with the The axes of the furnace body are parallel or coincident. The crucible 30 is set on the support base 20, the crucible 30 can be set on the base, the support rod can be rotated, and the rotation of the support rod can drive the crucible 30 to rotate, so that the crucible 30 can be heated evenly. The guide cylinder 40 can be arranged between the crucible 30 and the crystal pulling port 12 , and the guide cylinder 40 can be blocked and erected to guide the flow, so that the airflow can flow to the silicon melt 33 of the crucible 30 so as to drive the generated oxides. The crucible 30 may include a graphite crucible 31 and a quartz crucible 32 , the graphite crucible 31 may be set on the support base 20 , and the quartz crucible 32 may be set inside the graphite crucible 31 .

過濾裝置50可以設置於導流筒40的內側壁上,過濾裝置50可以設置於導流筒40的下端位置,過濾裝置50上與拉晶口12對應的位置可以設有拉晶通道,拉晶通道可以為圓形,通過拉晶通道可以便於拉晶,便於晶棒60通過。過濾裝置50上可以設置有多個氣流通道53,多個氣流通道53可以間隔設置。過濾裝置50的數量可以為一個或多個,比如,過濾裝置50的數量為多個,多個過濾裝置50可以沿導流筒40的軸線方向間隔設置,增強過濾以及導流效果。The filter device 50 can be arranged on the inner side wall of the guide cylinder 40, the filter device 50 can be arranged at the lower end position of the guide cylinder 40, and the position corresponding to the crystal pulling port 12 on the filter device 50 can be provided with a crystal pulling channel. The channel can be circular, and the crystal pulling channel can be used to facilitate crystal pulling and facilitate the passage of crystal rods 60 . A plurality of airflow channels 53 may be provided on the filter device 50, and the plurality of airflow channels 53 may be arranged at intervals. The number of filter devices 50 can be one or more, for example, there are multiple filter devices 50 , and multiple filter devices 50 can be arranged at intervals along the axial direction of the guide cylinder 40 to enhance the filtering and flow guiding effects.

在本發明實施例的拉晶爐中,過濾裝置50設置於導流筒40的內側壁上,過濾裝置50上與拉晶口12對應的位置設有拉晶通道,過濾裝置50上設置有多個氣流通道53。通過過濾裝置50可以過濾矽熔體與石英坩堝反應生成的氧化矽在拉晶爐上方的凝結物以及拉晶爐上方的其他顆粒物體或惰性氣體流中的其他不純物,防止較冷物質跌落到晶體生長的固液交界面附近,防止較冷物質帶來熱衝擊,避免局部溫度的震盪。在拉晶過程中,過濾裝置50可以阻隔生成的氧化矽氣體向上漂浮,惰性氣體由上方向下流動,經過過濾裝置50後可以過濾掉存在固體雜質顆粒,同時過濾裝置50的氣流通道53可以改變惰性氣體紊流,使通過的氣流有序掠過熔體表面,及時帶走氧化矽氣體,通過過濾裝置50可以有效阻止熱衝擊的產生,減少惰性氣體的紊流,大大減少晶棒斷線的機率,提高晶棒的整體良率。In the crystal pulling furnace of the embodiment of the present invention, the filter device 50 is arranged on the inner side wall of the guide cylinder 40, and the position corresponding to the crystal pulling port 12 on the filter device 50 is provided with a crystal pulling channel, and the filter device 50 is provided with multiple Airflow channel 53. Through the filter device 50, the condensate of silicon oxide generated by the reaction between the silicon melt and the quartz crucible above the crystal pulling furnace and other particulate objects above the crystal pulling furnace or other impurities in the inert gas flow can be filtered to prevent colder substances from falling to the crystal. Near the growing solid-liquid interface, prevent thermal shock from cooler substances and avoid local temperature fluctuations. During the crystal pulling process, the filter device 50 can block the generated silicon oxide gas from floating upward, and the inert gas flows from the top to the bottom. After passing through the filter device 50, the solid impurity particles can be filtered out. The turbulent flow of the inert gas makes the passing airflow pass over the surface of the melt in an orderly manner, and the silicon oxide gas is taken away in time. The generation of thermal shock can be effectively prevented through the filter device 50, the turbulent flow of the inert gas is reduced, and the possibility of crystal rod breakage is greatly reduced. probability and improve the overall yield of crystal ingots.

在一些實施例中,如圖1所示,過濾裝置50可以包括環形板,環形板的外周與導流筒40的內側壁連接,環形板的軸線可以與爐體10的軸線平行或重合。多個氣流通道53可以間隔設置在環形板上,環形板中部的圓形孔作為拉晶通道。經過環形板後可以過濾掉存在固體雜質顆粒,同時環形板的氣流通道53可以改變惰性氣體紊流,使通過的氣流有序掠過熔體表面,及時帶走氧化矽氣體,通過環形板可以有效阻止熱衝擊的產生,減少惰性氣體的紊流。In some embodiments, as shown in FIG. 1 , the filtering device 50 may include an annular plate, the outer periphery of which is connected to the inner wall of the draft tube 40 , and the axis of the annular plate may be parallel to or coincident with the axis of the furnace body 10 . A plurality of gas flow channels 53 may be arranged on the annular plate at intervals, and the circular hole in the middle of the annular plate serves as a crystal pulling channel. After passing through the annular plate, solid impurity particles can be filtered out. At the same time, the air flow channel 53 of the annular plate can change the turbulent flow of the inert gas, so that the passing air flow can pass over the surface of the melt in an orderly manner, and the silicon oxide gas can be taken away in time. Through the annular plate, it can effectively Prevent thermal shock and reduce turbulent flow of inert gas.

在另一些實施例中,如圖3至圖4所示,過濾裝置50可以包括錐筒,氣流通道53設置於錐筒的側壁上,拉晶通道沿錐筒的軸線方向貫穿,錐筒靠近拉晶口12一端的直徑小於錐筒遠離拉晶口12一端的直徑,便於通過氣流通道53過濾固體雜質顆粒,使得氣流通道53可以改變惰性氣體紊流。錐筒的側壁具有一定傾斜角度,可以改變惰性氣體流的方向,使之均勻地吹向晶棒表面,加快晶棒冷卻,提高拉晶速率。在顆粒被阻擋後,顆粒可以沿著錐筒的外側壁向下移動,減少對於氣流通道53的阻塞。In some other embodiments, as shown in FIGS. 3 to 4 , the filter device 50 may include a cone, the air flow channel 53 is arranged on the side wall of the cone, the crystal pulling channel runs through the axis of the cone, and the cone is close to the puller. The diameter of one end of the crystal port 12 is smaller than the diameter of the end of the cone away from the crystal pulling port 12, which is convenient for filtering solid impurity particles through the gas flow channel 53, so that the gas flow channel 53 can change the turbulent flow of the inert gas. The side wall of the cone has a certain inclination angle, which can change the direction of the inert gas flow, so that it can be evenly blown to the surface of the ingot, so as to accelerate the cooling of the ingot and increase the crystal pulling rate. After the particles are blocked, the particles can move down along the outer wall of the cone, reducing the blockage of the airflow channel 53 .

可選地,如圖1至圖4所示,導流筒40的內側壁可以設有支撐台41,支撐台41可以沿著導流筒40的內側壁的周向延伸,過濾裝置50的底部設置於支撐台41上,通過支撐台41可以支撐過濾裝置50。過濾裝置50的底部與支撐台41的上表面之間可以設置密封結構,減小間隙,防止固體雜質或氣流從間隙中通過。錐筒的底部邊沿可以設置於支撐台41上,錐筒的外側壁與導流筒40的內側壁可以間隔設置,錐筒的軸線與爐體10的軸線可以平行或重合。Optionally, as shown in FIGS. 1 to 4 , a support platform 41 may be provided on the inner side wall of the draft tube 40 , and the support platform 41 may extend along the circumferential direction of the inner side wall of the draft tube 40 , and the bottom of the filter device 50 It is arranged on the supporting platform 41 , and the filtering device 50 can be supported by the supporting platform 41 . A sealing structure may be provided between the bottom of the filtering device 50 and the upper surface of the supporting platform 41 to reduce the gap and prevent solid impurities or air flow from passing through the gap. The bottom edge of the cone can be set on the support platform 41 , the outer wall of the cone can be spaced apart from the inner wall of the guide tube 40 , and the axis of the cone can be parallel or coincident with the axis of the furnace body 10 .

支撐台41上位於導流筒40的內側壁與錐筒的外側壁之間的區域可以設有凹槽,在顆粒被阻擋後,顆粒可以沿著錐筒的外側壁向下移動,通過凹槽可以容納收集固體顆粒,減少對於氣流通道53的阻塞。The area between the inner side wall of the guide tube 40 and the outer side wall of the cone can be provided with a groove on the support table 41, and after the particles are blocked, the particles can move down along the outer side of the cone and pass through the groove. It can accommodate and collect solid particles, reducing the blockage of the airflow channel 53 .

可選地,過濾裝置50在第一平面上的正投影可以位於坩堝30在第一平面上的正投影內,第一平面與爐體10的軸線垂直,防止固體雜質顆粒進入坩堝30中的熔體,使得通過氣流通道53的氣體可以有序掠過熔體表面,及時帶走氧化矽氣體,有效阻止熱衝擊的產生。Optionally, the orthographic projection of the filtering device 50 on the first plane may be located within the orthographic projection of the crucible 30 on the first plane, and the first plane is perpendicular to the axis of the furnace body 10 to prevent solid impurity particles from entering the molten material in the crucible 30. body, so that the gas passing through the gas flow channel 53 can skim over the surface of the melt in an orderly manner, take away the silicon oxide gas in time, and effectively prevent the generation of thermal shock.

可選地,導流筒40在第一平面上的正投影位於坩堝30在第一平面上的正投影內,第一平面與爐體10的軸線垂直,使得導流後的氣體可以有序掠過熔體表面,及時帶走氧化矽氣體。Optionally, the orthographic projection of the draft tube 40 on the first plane is located within the orthographic projection of the crucible 30 on the first plane, and the first plane is perpendicular to the axis of the furnace body 10, so that the diverted gas can be swept in an orderly manner. Over the surface of the melt, the silicon oxide gas is taken away in time.

在一些實施例中,腔室11的內側壁可以設有導流板42,導流板42可以沿腔室11的內側壁的周向延伸,導流板42可以設置於導流筒40的外側,導流筒40與導流板42可以連接。使得通過氣流通道53的氣體有序掠過熔體表面後,通過導流板42的導流使得帶有氧化物的氣體可以沿著爐體10的內側壁向爐體10的底部流動,以便帶走氧化物,減少氧化物對於坩堝30、支撐座20以及其他部件的損傷或影響。In some embodiments, the inner wall of the chamber 11 may be provided with a deflector 42 , the deflector 42 may extend along the circumference of the inner wall of the chamber 11 , and the deflector 42 may be disposed on the outside of the deflector cylinder 40 , the guide cylinder 40 and the guide plate 42 can be connected. After the gas passing through the gas flow channel 53 has swept over the surface of the melt in an orderly manner, the gas with oxides can flow along the inner sidewall of the furnace body 10 to the bottom of the furnace body 10 through the flow guide of the deflector plate 42, so as to bring Oxidation is removed to reduce the damage or influence of the oxide on the crucible 30, the support base 20 and other components.

在本發明的實施例中,導流板42和導流筒40中至少一個可以為保溫材料件,比如,導流板42或導流筒40可以為保溫材料件,導流板42和導流筒40均可以為保溫材料件,提高保溫效果,減少熱損失。In an embodiment of the present invention, at least one of the deflector 42 and the deflector cylinder 40 can be an insulating material, for example, the deflector 42 or the deflector 40 can be an insulating material, and the deflector 42 and the deflector The cylinders 40 can all be made of heat-insulating material, so as to improve the heat-insulating effect and reduce heat loss.

導流板42和導流筒40中至少一個的表面可以設有保溫層,比如,導流板42或導流筒40的表面可以設有保溫層,導流板42和導流筒40的表面均設有保溫層,通過保溫層可以提高保溫效果,減少熱損失。The surface of at least one of the deflector 42 and the deflector cylinder 40 can be provided with an insulating layer, such as, the surface of the deflector 42 or the deflector cylinder 40 can be provided with an insulation layer, and the surface of the deflector 42 and the deflector cylinder 40 All are equipped with an insulation layer, through which the insulation effect can be improved and heat loss can be reduced.

可選地,如圖2所示,氣流通道53可以包括第一通道51和與第一通道51連通的第二通道52,第一通道51遠離坩堝30設置,第二通道52靠近坩堝30設置,第一通道51的直徑大於第二通道52的直徑,便於通過氣流通道53過濾固體雜質顆粒,使得氣流通道53可以改變惰性氣體紊流。Optionally, as shown in FIG. 2 , the gas flow channel 53 may include a first channel 51 and a second channel 52 communicated with the first channel 51, the first channel 51 is set away from the crucible 30, and the second channel 52 is set close to the crucible 30, The diameter of the first channel 51 is larger than the diameter of the second channel 52 , which is convenient for filtering solid impurity particles through the gas flow channel 53 , so that the gas flow channel 53 can change the turbulent flow of the inert gas.

可選地,氣流通道53的數量為多個,多個氣流通道53可以均勻分佈在過濾裝置50上,使得氣流通道53可以改變惰性氣體紊流,氣流分佈均勻。Optionally, the number of gas flow channels 53 is multiple, and the multiple gas flow channels 53 can be evenly distributed on the filter device 50, so that the gas flow channels 53 can change the turbulence of the inert gas, and the gas flow distribution is uniform.

可選地,導流筒40的軸線與爐體10的軸線共線或平行,拉晶通道的軸線與爐體10的軸線共線或平行,使得導流筒、拉晶通道位於爐體10的中心位置,有利於爐體10氣流以及溫度的均勻分佈。Optionally, the axis of the draft tube 40 is collinear or parallel to the axis of the furnace body 10, and the axis of the crystal pulling channel is collinear or parallel to the axis of the furnace body 10, so that the draft tube and the crystal pulling channel are located at the center of the furnace body 10. The central position is conducive to the uniform distribution of airflow and temperature of the furnace body 10 .

上面結合附圖對本發明的實施例進行了描述,但是本發明並不局限於上述的具體實施方式,上述的具體實施方式僅僅是示意性的,而不是限制性的,本領域的具有通常知識者在本發明的啟示下,在不脫離本發明宗旨和申請專利範圍所保護的範圍情況下,還可做出很多形式,均屬於本發明的保護之內。Embodiments of the present invention have been described above in conjunction with the accompanying drawings, but the present invention is not limited to the above-mentioned specific implementations, and the above-mentioned specific implementations are only illustrative, rather than restrictive, and those with ordinary knowledge in the art Under the enlightenment of the present invention, without departing from the purpose of the present invention and the scope protected by the scope of the patent application, many forms can also be made, all of which belong to the protection of the present invention.

10:爐體 11:腔室 12:拉晶口 20:支撐座 30:坩堝 31:石墨坩堝 32:石英坩堝 33:矽熔體 40:導流筒 41:支撐台 42:導流板 50:過濾裝置 51:第一通道 52:第二通道 53:氣流通道 60:晶棒 10: furnace body 11: chamber 12: Crystal port 20: Support seat 30: Crucible 31: graphite crucible 32: Quartz crucible 33: Silicon melt 40: deflector 41: support platform 42: deflector 50: Filtration device 51: The first channel 52:Second channel 53: Airflow channel 60: Ingot

圖1為拉晶爐的一個結構示意圖; 圖2為氣流通道的一個分佈示意圖; 圖3為過濾裝置設置於支撐臺上的一個局部示意圖; 圖4為過濾裝置設置於支撐臺上的一個示意圖。 Fig. 1 is a structural representation of crystal pulling furnace; Fig. 2 is a schematic diagram of the distribution of air passages; Fig. 3 is a partial schematic diagram of the filtering device being arranged on the supporting platform; Fig. 4 is a schematic diagram of a filter device disposed on a support platform.

10:爐體 10: furnace body

11:腔室 11: chamber

12:拉晶口 12: Crystal port

20:支撐座 20: Support seat

30:坩堝 30: Crucible

31:石墨坩堝 31: graphite crucible

32:石英坩堝 32: Quartz crucible

33:矽熔體 33: Silicon melt

40:導流筒 40: deflector

41:支撐台 41: support table

42:導流板 42: deflector

50:過濾裝置 50: Filtration device

60:晶棒 60: Ingot

Claims (10)

一種拉晶爐,包括: 爐體,該爐體具有腔室,該爐體設有與該腔室連通的拉晶口; 支撐座,該支撐座設置於該腔室中; 坩堝,該坩堝設置於該支撐座上; 導流筒,該導流筒設置於該坩堝與該拉晶口之間; 過濾裝置,該過濾裝置設置於該導流筒的內側壁上,該過濾裝置上與該拉晶口對應的位置設有拉晶通道,該過濾裝置上設置有多個氣流通道。 A crystal pulling furnace, comprising: A furnace body, the furnace body has a chamber, and the furnace body is provided with a crystal pulling port communicated with the chamber; a support seat, the support seat is arranged in the chamber; a crucible, the crucible is arranged on the support base; A draft tube, the draft tube is arranged between the crucible and the crystal pulling port; A filtering device, the filtering device is arranged on the inner side wall of the guide cylinder, a crystal pulling channel is arranged on the filtering device corresponding to the crystal pulling port, and a plurality of air flow channels are arranged on the filtering device. 如請求項1所述的拉晶爐,其中,該過濾裝置包括環形板,該環形板的外周與該導流筒的內側壁連接。The crystal pulling furnace as claimed in claim 1, wherein the filtering device comprises an annular plate, and the outer periphery of the annular plate is connected to the inner side wall of the draft tube. 如請求項1所述的拉晶爐,其中,該過濾裝置包括錐筒,該氣流通道設置於該錐筒的側壁上,該拉晶通道沿該錐筒的軸線方向貫穿,該錐筒靠近該拉晶口一端的直徑小於該錐筒遠離該拉晶口一端的直徑。The crystal pulling furnace as claimed in claim 1, wherein the filter device includes a cone, the airflow channel is arranged on the side wall of the cone, the crystal pulling channel runs through the axis of the cone, and the cone is close to the The diameter of one end of the crystal pulling mouth is smaller than the diameter of the end of the cone tube away from the crystal pulling mouth. 如請求項1所述的拉晶爐,其中,該導流筒的內側壁設有支撐台,該過濾裝置的底部設置於該支撐臺上。The crystal pulling furnace as claimed in claim 1, wherein the inner wall of the draft tube is provided with a support platform, and the bottom of the filtering device is arranged on the support platform. 如請求項1所述的拉晶爐,其中,該過濾裝置在第一平面上的正投影位於該坩堝在該第一平面上的正投影內,該第一平面與該爐體的軸線垂直。The crystal pulling furnace according to claim 1, wherein the orthographic projection of the filter device on the first plane is located within the orthographic projection of the crucible on the first plane, and the first plane is perpendicular to the axis of the furnace body. 如請求項1所述的拉晶爐,其中,該導流筒在第一平面上的正投影位於該坩堝在該第一平面上的正投影內,該第一平面與該爐體的軸線垂直。The crystal pulling furnace according to claim 1, wherein the orthographic projection of the draft tube on the first plane is located within the orthographic projection of the crucible on the first plane, and the first plane is perpendicular to the axis of the furnace body . 如請求項1所述的拉晶爐,其中,該腔室的內側壁設有導流板,該導流板沿該腔室的內側壁的周向延伸,該導流板設置於該導流筒的外側,該導流筒與該導流板連接。The crystal pulling furnace as claimed in item 1, wherein, the inner wall of the chamber is provided with a deflector, and the deflector extends along the circumferential direction of the inner wall of the chamber, and the deflector is arranged on the The outside of the tube, the guide tube is connected with the guide plate. 如請求項7所述的拉晶爐,其中,該導流板和該導流筒中至少一個為保溫材料件;和/或 該導流板和該導流筒中至少一個的表面設有保溫層。 The crystal pulling furnace as claimed in claim 7, wherein at least one of the deflector and the deflector is a piece of thermal insulation material; and/or The surface of at least one of the deflector and the deflector is provided with an insulating layer. 如請求項1所述的拉晶爐,其中,該氣流通道包括第一通道和與該第一通道連通的第二通道,該第一通道遠離該坩堝設置,該第二通道靠近該坩堝設置,該第一通道的直徑大於該第二通道的直徑。The crystal pulling furnace as claimed in item 1, wherein the gas flow channel includes a first channel and a second channel communicated with the first channel, the first channel is set away from the crucible, and the second channel is set close to the crucible, The diameter of the first channel is larger than the diameter of the second channel. 如請求項1所述的拉晶爐,其中,多個該氣流通道均勻分佈在該過濾裝置上;和/或 該導流筒的軸線與該爐體的軸線共線或平行;和/或 該拉晶通道的軸線與該爐體的軸線共線或平行。 The crystal pulling furnace as claimed in item 1, wherein a plurality of the gas flow channels are evenly distributed on the filtering device; and/or The axis of the draft tube is collinear or parallel to the axis of the furnace body; and/or The axis of the crystal pulling channel is collinear or parallel to the axis of the furnace body.
TW111139988A 2022-07-13 2022-10-21 Crystal puller TWI812518B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN202210825183.5 2022-07-13
CN202210825183.5A CN115074829B (en) 2022-07-13 2022-07-13 Crystal pulling furnace

Publications (2)

Publication Number Publication Date
TW202305207A true TW202305207A (en) 2023-02-01
TWI812518B TWI812518B (en) 2023-08-11

Family

ID=83260032

Family Applications (1)

Application Number Title Priority Date Filing Date
TW111139988A TWI812518B (en) 2022-07-13 2022-10-21 Crystal puller

Country Status (2)

Country Link
CN (1) CN115074829B (en)
TW (1) TWI812518B (en)

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2821481C2 (en) * 1978-05-17 1985-12-05 Wacker-Chemitronic Gesellschaft für Elektronik-Grundstoffe mbH, 8263 Burghausen Device for pulling high-purity semiconductor rods from the melt
EP0191111B1 (en) * 1984-12-28 1991-09-18 International Business Machines Corporation Improvements to pulling processes and equipment for growing silicon crystals having high and controlled carbon content
JP2504875B2 (en) * 1991-06-18 1996-06-05 コマツ電子金属株式会社 Single crystal manufacturing equipment
JP2827789B2 (en) * 1993-02-23 1998-11-25 信越半導体株式会社 Inert gas straightening and spraying equipment for single crystal pulling equipment
US8152921B2 (en) * 2006-09-01 2012-04-10 Okmetic Oyj Crystal manufacturing
KR101044124B1 (en) * 2008-11-21 2011-06-28 주식회사 엘지실트론 Cleaning method and cleaning module for manufacturing apparatus for crystal ingot
KR20110000174A (en) * 2009-06-26 2011-01-03 네오세미테크 주식회사 The ar gsa flow filtering machine
RU2472875C1 (en) * 2011-08-24 2013-01-20 Общество с ограниченной ответственностью "Макси-М" Method for growing silicon monocrystal from molten metal
WO2014197672A1 (en) * 2013-06-05 2014-12-11 Sunedison, Inc. Insitu sneeze valve for clearing exhaust of a czochralski growth chamber
KR101528055B1 (en) * 2013-11-25 2015-06-11 주식회사 엘지실트론 Ingot growing apparatus
KR20150106204A (en) * 2014-03-11 2015-09-21 (주)기술과가치 Apparatus for manufacturing ingot
CN206783819U (en) * 2017-05-10 2017-12-22 江西豪安能源科技有限公司 A kind of direct-pulling single crystal furnace thermal field device
CN111519241B (en) * 2019-02-01 2021-12-17 上海新昇半导体科技有限公司 Semiconductor crystal growth device
CN110983430A (en) * 2019-12-23 2020-04-10 大同新成新材料股份有限公司 Growth equipment convenient to regulate and control for monocrystalline silicon and growth method thereof
CN110983429A (en) * 2019-12-23 2020-04-10 西安奕斯伟硅片技术有限公司 Single crystal furnace and monocrystalline silicon preparation method
CN113755941A (en) * 2020-06-05 2021-12-07 隆基绿能科技股份有限公司 Heat exchange device and single crystal furnace
CN113755944A (en) * 2020-06-05 2021-12-07 西安奕斯伟材料科技有限公司 Single crystal furnace thermal field structure, single crystal furnace and crystal bar
CN111850677A (en) * 2020-07-31 2020-10-30 西安奕斯伟硅片技术有限公司 Crystal pulling furnace
CN112481693A (en) * 2020-12-01 2021-03-12 西安奕斯伟硅片技术有限公司 Crystal pulling furnace
CN113089079A (en) * 2021-04-15 2021-07-09 曲靖阳光能源硅材料有限公司 Heat shield guide cylinder of single crystal furnace
CN215366058U (en) * 2021-08-11 2021-12-31 西安奕斯伟材料科技有限公司 Single crystal furnace

Also Published As

Publication number Publication date
CN115074829A (en) 2022-09-20
TWI812518B (en) 2023-08-11
CN115074829B (en) 2024-01-26

Similar Documents

Publication Publication Date Title
US20080053372A1 (en) Crystal manufacturing
TWI808423B (en) A single crystal furnace thermal field structure, single crystal furnace and ingot
CN214529320U (en) Single crystal furnace
WO2022253233A1 (en) Temperature zone control system and crystal growth apparatus
CN112501690A (en) Growth method of sapphire single crystal
TW201447057A (en) Crucible assembly for controlling oxygen and related methods
CN210215612U (en) Large-diameter efficient N-type monocrystalline silicon single crystal furnace
US10487418B2 (en) Seed chuck assemblies and crystal pulling systems for reducing deposit build-up during crystal growth process
TWI598475B (en) Weir for improved crystal growth in a continuous czochralski process
JPH0639351B2 (en) Apparatus and method for manufacturing single crystal ingot
TW202305207A (en) Crystal pulling furnace
TWI832389B (en) A thermal field adjustment device and method for single crystal growth
WO2023185536A1 (en) Draft tube for pulling of single crystals and single crystal furnace provided with same
CN110965118B (en) Guide cylinder device and crystal pulling furnace
JP3750174B2 (en) Single crystal manufacturing apparatus and manufacturing method
TW202142747A (en) Combined sleeve of single crystal furnace and single crystal furnace including an inner cylinder, an outer cylinder, an annular base plate and a sleeve
CN211367801U (en) Novel cooling device for czochralski single crystal furnace
CN109666968B (en) Method for producing silicon single crystal
CN113638038A (en) Single crystal furnace with low oxygen impurity content
CN114574943B (en) Single crystal furnace and single crystal
CN112481693A (en) Crystal pulling furnace
JP5776587B2 (en) Single crystal manufacturing method
TWI838758B (en) System for controlling temperature zone and crystal growth system
JPH09309787A (en) Eater-cooling tower for single crystal-pulling up apparatus
CN219157035U (en) Water-cooling screen and monocrystalline silicon growth device