TW202248628A - Inspection device, inspection method, manufacturing method of glass plates, inspection program, and computer program product - Google Patents
Inspection device, inspection method, manufacturing method of glass plates, inspection program, and computer program product Download PDFInfo
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
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- G06T7/0004—Industrial image inspection
- G06T7/001—Industrial image inspection using an image reference approach
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8854—Grading and classifying of flaws
- G01N2021/8858—Flaw counting
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
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- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8883—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges involving the calculation of gauges, generating models
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
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Abstract
Description
本發明是有關於一種檢查裝置等,基於拍攝玻璃板所得的圖像來進行玻璃板的缺陷檢查。The present invention relates to an inspection device and the like for inspecting defects of a glass plate based on an image obtained by taking a glass plate.
先前,玻璃板的製造中的玻璃板的缺陷檢查、尤其是玻璃板所產生的缺陷的尺寸檢測是藉由目視而進行,因而不可避免地產生人力成本。針對所述問題,於專利文獻1揭示有下述技術,即:對拍攝玻璃板的端面所得的圖像進行圖像處理,進行缺陷的尺寸檢測。
[現有技術文獻]
[專利文獻]
Conventionally, defect inspection of glass sheets in the manufacture of glass sheets, especially size inspection of defects generated in glass sheets, was performed by visual inspection, and thus labor costs were inevitably incurred. In view of such a problem,
[專利文獻1]國際公開第2004/079352號公報[Patent Document 1] International Publication No. 2004/079352
[發明所欲解決之課題] 於如上所述的先前技術中,本申請案的發明者等人發現了下述問題,即:有時無法以充分的精度檢測缺陷的尺寸等。關於所述問題,可認為下述情況成為一個原因,即:於拍攝玻璃板所得的圖像中,缺陷周邊的深淺大多不清晰。 [Problem to be Solved by the Invention] In the prior art as described above, the inventors of the present application found a problem that the size and the like of a defect may not be detected with sufficient accuracy. One of the causes of the above-mentioned problems is considered to be that the depth of the periphery of the defect is often unclear in the image obtained by capturing the glass plate.
本發明的目的在於提供一種檢查裝置等,可於玻璃板所產生的缺陷的尺寸檢測中,兼顧人力成本的降低與檢測精度的維持。 [解決課題之手段] The object of the present invention is to provide an inspection device, etc., which can balance the reduction of labor costs and the maintenance of detection accuracy in the size detection of defects generated in glass plates. [Means to solve the problem]
為了解決所述課題,本發明的一態樣的檢查裝置包括:圖像獲取部,獲取拍攝玻璃板所得的拍攝圖像;以及尺寸檢測部,檢測向學習完畢模型輸入所述拍攝圖像所得的推論結果中的、範圍的尺寸,作為所拍攝的所述玻璃板所產生的缺陷的尺寸,所述學習完畢模型以推論玻璃板所產生的缺陷的位置及所述範圍的方式,對所述位置及範圍進行了學習。In order to solve the above-mentioned problems, an inspection device according to an aspect of the present invention includes: an image acquisition unit that acquires a captured image of a glass plate; In the inference result, the size of the range is taken as the size of the defect generated on the glass plate, and the learned model calculates the position of the defect generated on the glass plate and the range. and scope were studied.
為了解決所述課題,本發明的一態樣的檢查方法是由檢查裝置所執行,且包括:圖像獲取步驟,獲取拍攝玻璃板所得的拍攝圖像;以及尺寸檢測步驟,檢測向學習完畢模型輸入所述拍攝圖像所得的推論結果中的、範圍的尺寸,作為所拍攝的所述玻璃板所產生的缺陷的尺寸,所述學習完畢模型以推論玻璃板所產生的缺陷的位置及所述範圍的方式,對所述位置及範圍進行了學習。In order to solve the above-mentioned problems, an inspection method according to an aspect of the present invention is performed by an inspection device, and includes: an image acquisition step of acquiring a captured image obtained by photographing a glass plate; and a size detection step of detecting a learned model. The size of the range in the inference result obtained by the captured image is input as the size of the defect generated on the glass plate captured, and the learned model is used to infer the position of the defect generated on the glass plate and the The location and range are learned in a range-based manner.
為了解決所述課題,本發明的一態樣的玻璃板的製造方法包含:將玻璃原板成型為既定尺寸的玻璃板的步驟、以及由檢查裝置所執行的所述玻璃板的檢查步驟,並且所述檢查步驟包含:圖像獲取步驟,獲取拍攝所述玻璃板所得的拍攝圖像;以及尺寸檢測步驟,檢測向學習完畢模型輸入所述拍攝圖像所得的推論結果中的、範圍的尺寸,作為所拍攝的所述玻璃板所產生的缺陷的尺寸,所述學習完畢模型以推論所述玻璃板所產生的缺陷的位置及所述範圍的方式,對所述位置及範圍進行了學習。 [發明的效果] In order to solve the above-mentioned problems, a method for manufacturing a glass plate according to an aspect of the present invention includes a step of molding an original glass plate into a glass plate of a predetermined size, and an inspection step of the glass plate performed by an inspection device, and the The inspection step includes: an image acquisition step of acquiring a photographed image of the glass plate; and a size detection step of detecting the size of a range in an inference result obtained by inputting the photographed image to the learned model as The size of the defect generated on the glass plate is imaged, and the learned model learns the position and range of the defect generated on the glass plate so as to infer the position and range of the defect generated on the glass plate. [Effect of the invention]
根據本發明的一態樣,可於玻璃板所產生的缺陷的尺寸檢測中,兼顧人力成本的降低與檢測精度的維持。According to an aspect of the present invention, in the dimension detection of the defect generated in the glass plate, both the reduction of labor cost and the maintenance of detection accuracy can be taken into account.
[實施形態1]
(檢查系統100)
以下,對本發明的一實施形態加以詳細說明。圖1為表示本實施形態的檢查系統100的概要、及檢查系統100所含的檢查裝置1的要部結構的一例的區塊圖。
[Embodiment 1]
(check system 100)
Hereinafter, an embodiment of the present invention will be described in detail. FIG. 1 is a block diagram showing an overview of an
檢查系統100為檢測於玻璃板的端面產生的缺陷的尺寸的系統。再者,本實施形態中,設玻璃板為矩形狀而進行說明,但玻璃板的形狀不限定於該例。所謂缺陷,例如為於玻璃板的端面產生的破裂、缺損等。檢查系統100包含檢查裝置1、攝像裝置2、圖像記憶裝置3及檢測結果記憶裝置4。The
檢查裝置1為檢測於玻璃板的端面產生的缺陷的尺寸的裝置。對於玻璃板的端面,先前藉由目視進行缺陷的尺寸檢測,而且,使用圖像處理的尺寸檢測有時因拍攝圖像中的缺陷周邊的深淺不清晰而難以進行正確的尺寸檢測。雖然詳細情況將於後述,但檢查裝置1檢測向學習完畢模型輸入拍攝圖像所得的缺陷的推論結果中的、範圍的尺寸,作為缺陷的尺寸,所述學習完畢模型以推論於端面產生的缺陷的位置及範圍的方式進行了學習。即,人不參與端面的缺陷的尺寸檢測,故而可降低該檢測耗費的人力成本。而且,於該學習完畢模型的學習中,藉由將缺陷周邊的深淺不清晰的端面的圖像作為示教資料進行多數次學習,從而由缺陷周邊的深淺不清晰的端面的圖像亦可高精度地檢測缺陷。因此,可於玻璃板的端面所產生的缺陷的尺寸檢測中,兼顧人力成本的降低與檢測精度的維持。The
攝像裝置2為拍攝玻璃板的端面的裝置。此處,所謂端面,為將玻璃板的最廣的兩面分別設為上面、下面時的側面部分,亦可稱為外周部。下文中,有時將玻璃板的四個端面分別表述為X1端面、X2端面、Y1端面及Y2端面。再者,設X1端面與X2端面為互相平行的端面,Y1端面與Y2端面為互相平行的端面。The
作為一例,攝像裝置2配置於沿著搬送玻璃板的搬送裝置(未圖示)的搬送路徑的位置,以既定的時間間隔連續拍攝由搬送裝置進行搬送中的玻璃板的一個端面。如此,藉由對一個端面進行多次拍攝,從而可獲得將一個端面分割為多個的多個拍攝圖像,而且可使各拍攝圖像的端面的解析度高至充分進行檢查的程度。當然,若即便由一次拍攝來拍攝一個端面整體亦可獲得充分解析度的拍攝圖像,則拍攝次數可為一次。As an example, the
於圖1僅圖示一個攝像裝置2,但攝像裝置2亦可針對玻璃板的每個端面設置。例如,亦可將兩個攝像裝置2以隔著搬送路徑彼此相向的方式配置,同時拍攝互相平行的端面(例如X1端面與X2端面、或Y1端面與Y2端面)。而且,於搬送路徑分支的情形時,亦可於每個分支配置攝像裝置2。Only one
而且,雖圖示省略,但可於攝像裝置2隨附有照明裝置及資訊處理裝置,一方面藉由照明裝置向玻璃板的端面照射光,一方面藉由攝像裝置2拍攝端面。Moreover, although the illustration is omitted, the
所述資訊處理裝置為對攝像裝置2拍攝的拍攝圖像賦予附加資訊並記憶於圖像記憶裝置3的裝置。附加資訊中,包含表示拍攝圖像中拍到的玻璃板的玻璃識別資訊、及表示所述拍攝圖像中拍到的是玻璃板的哪一部分的玻璃位置資訊。The information processing device is a device that adds additional information to the captured image captured by the
玻璃識別資訊例如亦可為對各玻璃板賦予的識別編號。玻璃位置資訊只要為表示玻璃板的哪一部分的資訊即可。例如,於玻璃板的搬送速度為一定,端面每一處的拍攝次數亦為一定的情形時,亦可將表示為由哪次拍攝所得的拍攝圖像的資訊作為玻璃位置資訊。The glass identification information may be, for example, an identification number given to each glass plate. The glass position information only needs to be information indicating what part of the glass plate is. For example, when the conveying speed of the glass plate is constant and the number of photographs taken at each position of the end surface is also constant, the information indicating which photographed image was obtained may be used as the glass position information.
圖像記憶裝置3為記憶攝像裝置2拍攝的拍攝圖像的記憶裝置。而且,檢測結果記憶裝置4為記憶檢查裝置1所檢測的檢測結果、即表示缺陷的尺寸的資訊的記憶裝置。再者,圖像記憶裝置3及檢測結果記憶裝置4亦可分別設置多個。例如,亦可針對玻璃板的每個端面設置圖像記憶裝置3及檢測結果記憶裝置4。而且,亦可省略圖像記憶裝置3及檢測結果記憶裝置4。此時,只要使攝像裝置2向檢查裝置1發生拍攝圖像,使檢查裝置1將檢測結果記憶於記憶部11即可。The
(檢查裝置1)
檢查裝置1如圖1所示,包括控制部10、記憶部11及通訊部12。控制部10綜合控制檢查裝置1的各部。記憶部11記憶檢查裝置1使用的各種資料。通訊部12用於檢查裝置1與其他裝置進行通訊。該其他裝置的典型例為圖像記憶裝置3及檢測結果記憶裝置4。
(check device 1)
As shown in FIG. 1 , the
控制部10如圖1所示,包含圖像獲取部101、缺陷判定部102及尺寸檢測部103。記憶部11記憶缺陷判定模型111及尺寸檢測模型112。As shown in FIG. 1 , the
圖像獲取部101獲取拍攝玻璃板所得的拍攝圖像。本實施形態中,圖像獲取部101獲取的拍攝圖像如上文所述,為攝像裝置2拍攝玻璃板的端面所得的拍攝圖像。作為一例,圖像獲取部101自圖像記憶裝置3經由通訊部12接收拍攝圖像。The
缺陷判定部102判定拍攝圖像中拍到的端面中有無缺陷。具體而言,缺陷判定部102向缺陷判定模型111輸入自圖像獲取部101獲取的拍攝圖像,基於自缺陷判定模型111輸出的推論結果判定有無缺陷。The
此處,對缺陷判定模型111加以說明。缺陷判定模型111為以推論拍攝玻璃板的端面所得的拍攝圖像中有無缺陷的方式進行了學習的、學習完畢模型。此種缺陷判定模型111是藉由將已知有無缺陷的多數個拍攝圖像作為示教資料的機器學習而構建。關於機器學習的算法,只要可生成能將拍攝圖像分類為有缺陷與無缺陷兩種的、缺陷判定模型111即可,並無特別限定。例如,圖像的分類精度高的、深度學習的卷積類神經網路(convolution neural network)等合適,但不限於該例。Here, the
而且,缺陷判定部102亦可針對缺陷的種類進行判定。於亦進行針對缺陷的種類的判定的情形時,只要針對缺陷的每個種類準備示教資料,進行使用該些示教資料的機器學習即可。作為缺陷的種類,例如可列舉上文所述的破裂、缺損等。In addition, the
尺寸檢測部103檢測向尺寸檢測模型112輸入拍攝圖像所得的推論結果中的、缺陷的範圍的尺寸,作為所拍攝的玻璃板所產生的缺陷的尺寸。The
此處,對尺寸檢測模型112加以說明。尺寸檢測模型112為以推論玻璃板所產生的缺陷的位置及範圍的方式,對該位置及範圍進行了學習的學習完畢模型。此種,尺寸檢測模型112可藉由使用下述示教資料的機器學習而構建,所述示教資料針對拍到缺陷的拍攝圖像,使所述缺陷的位置及範圍作為正解資料進行了關聯。缺陷的位置及範圍例如亦可由包圍該缺陷的矩形表示。於該情形時,該矩形的位置表示缺陷的位置,該矩形的寬度及高度表示缺陷的範圍即尺寸。Here, the
作為所述示教資料,較佳為使用缺陷周邊的深淺不清晰的多數個拍攝圖像。藉此,由缺陷周邊的深淺不清晰的拍攝圖像亦可高精度地檢測缺陷的尺寸。機器學習的算法與缺陷判定模型111同樣地,並無特別限定。As the teaching data, it is preferable to use a plurality of captured images in which the shades of the periphery of the defect are not clear. Thereby, the size of the defect can be detected with high precision even from the photographed image with blurred shades around the defect. The algorithm of machine learning is not particularly limited in the same way as the
而且,於缺陷判定部102判定缺陷的種類的情形時,亦可針對缺陷的每個種類預先準備尺寸檢測模型112,尺寸檢測部103利用與缺陷判定部102所判定的種類相應的尺寸檢測模型112來進行尺寸檢測。藉此,可提高尺寸的檢測精度。例如,亦可將拍攝產生破裂的玻璃板的端面所得的拍攝圖像作為示教資料,構建破裂缺陷用的尺寸檢測模型112,並且將拍攝產生缺損的玻璃板的端面所得的拍攝圖像作為示教資料,構建缺損缺陷用的尺寸檢測模型112。於該情形時,針對缺陷判定部102判定為產生破裂缺陷的拍攝圖像,只要使用破裂缺陷用的尺寸檢測模型112進行尺寸檢測即可。另一方面,針對缺陷判定部102判定為產生缺損缺陷的拍攝圖像,只要使用缺損缺陷用的尺寸檢測模型112進行尺寸檢測即可。Furthermore, when the
(推論例)
圖2為表示利用尺寸檢測模型112的缺陷的位置及範圍的推論例的圖。本例中,攝像裝置2拍攝玻璃板的端面所得的圖像為拍攝圖像21。於拍攝圖像21的中央部沿橫向延伸的黑色部分為玻璃板的端面,玻璃板的端面中央部附近所拍到的白色部分為缺陷。如上文所述,拍攝圖像21記憶於圖像記憶裝置3。
(inference example)
FIG. 2 is a diagram showing an example of inference of the position and range of a defect using the
檢查裝置1的圖像獲取部101自圖像記憶裝置3獲取所述拍攝圖像21。若獲取拍攝圖像21,則首先缺陷判定部102將拍攝圖像21輸入至缺陷判定模型111,基於自缺陷判定模型111輸出的推論結果判定有無缺陷。拍攝圖像21中如上所述般拍到缺陷,故而缺陷判定部102判定為有缺陷。再者,如上所述,缺陷判定部102亦可針對缺陷的種類進行判定,但此處僅判定有無缺陷。The
針對缺陷判定部102判定為有缺陷的拍攝圖像21,由尺寸檢測部103進行尺寸的檢測。即,尺寸檢測部103向尺寸檢測模型112輸入拍攝圖像21,獲取尺寸檢測模型112輸出的推論結果。所述推論結果表示拍攝圖像21中的缺陷的位置及範圍。The
尺寸檢測部103使所述推論結果所示的範圍作為表示缺陷尺寸的尺寸資訊記憶於檢測結果記憶裝置4。例如於所述範圍為矩形的情形時,尺寸檢測部103只要使拍攝圖像21中的表示該矩形的位置的代表座標(例如矩形的左上角的座標)、以及表示該矩形的寬度及高度的尺寸資訊記憶即可。The
圖2所示的圖像31中,以矩形41表示尺寸檢測模型112的推論結果。如圖所示,矩形41的寬度及高度與缺陷的寬度及高度相等,由此可知進行了準確的推論。In the
此種矩形亦可稱為註解(annotation)。藉由顯示註解,從而可使檢查裝置1的用戶目視確認推論結果。藉由使用由將拍到缺陷的拍攝圖像作為示教資料的機器學習所構建的尺寸檢測模型112,從而可如此準確地檢測缺陷部分。Such rectangles may also be called annotations. By displaying the comment, the user of the
(玻璃板的製造步驟中的檢查)
由檢查裝置1進行的檢查亦可作為玻璃板的製造步驟的一環而進行。此時,基於圖3對伴有由檢查裝置1進行的檢查的、玻璃板的製造步驟例加以說明。圖3為表示伴有由檢查裝置1進行的檢查的、玻璃板的製造步驟的一例的流程圖。
(Inspection in manufacturing steps of glass plate)
The inspection by the
S101中,將玻璃原板成型為既定尺寸的玻璃板。玻璃原板為較成為製品的玻璃板更為大型的尺寸的玻璃板,藉由玻璃原板的製造裝置而製造。S101中,玻璃原板例如藉由將該玻璃原板切斷為既定尺寸的切斷裝置、及對切斷後的玻璃板的端面進行加工的加工裝置而調整為既定尺寸的玻璃板。In S101, the original glass plate is molded into a glass plate of a predetermined size. The original glass plate is a glass plate of a larger size than the glass plate to be a product, and is manufactured by a glass original plate manufacturing device. In S101, the original glass plate is adjusted to a glass plate of a predetermined size by, for example, a cutting device that cuts the original glass plate into a predetermined size, and a processing device that processes the end surface of the cut glass plate.
S102中,檢查裝置1執行檢查步驟。由該檢查步驟判定為良品的玻璃板成為製品。以下基於圖4對檢查步驟的詳細加以說明。In S102, the
(檢查步驟的流程)
圖4為表示圖3所示的檢查步驟的一例的流程圖。再者,設檢查步驟開始前,攝像裝置2拍攝檢查對象的玻璃板的端面,並將其拍攝圖像記憶於圖像記憶裝置3。而且,執行圖4所示的檢查步驟的時機並無特別限定。例如,可於每當拍攝新圖像並記憶於圖像記憶裝置3時進行,亦可每當一片玻璃板的一個端面的拍攝結束時進行,亦可於檢查對象的所有玻璃板的所有端面的拍攝結束後進行。
(Flow of checking steps)
FIG. 4 is a flowchart showing an example of the inspection procedure shown in FIG. 3 . Furthermore, it is assumed that before the inspection step starts, the
S1(圖像獲取步驟)中,圖像獲取部101自圖像記憶裝置3獲取拍攝圖像。於圖像記憶裝置3記憶有多個拍攝圖像的情形時,只要獲取尚未供於檢查步驟的拍攝圖像即可。繼而,圖像獲取部101向缺陷判定部102輸出所獲取的拍攝圖像。In S1 (image acquisition step), the
S2中,缺陷判定部102將S1中獲取的拍攝圖像輸入至缺陷判定模型111,基於自缺陷判定模型111輸出的推論結果來判定有無缺陷。而且,此處設缺陷判定部102亦對缺陷的種類進行判定。In S2, the
S3中,尺寸檢測部103決定將預先記憶於記憶部11的多個尺寸檢測模型中與S2中判定的缺陷的種類對應的尺寸檢測模型112用於尺寸檢測。再者,於S2中判定為無缺陷的情形時,不進行S3以後的處理,針對S1中獲取的拍攝圖像的檢查步驟結束。In S3, the
S4(尺寸檢測步驟)中,尺寸檢測部103向S3中決定的尺寸檢測模型112輸入S1中獲取的拍攝圖像。繼而,尺寸檢測部103檢測自尺寸檢測模型112輸出的推論結果中的、範圍的尺寸(換言之,推論結果所示的範圍的大小),作為缺陷的尺寸。例如,於所述範圍為矩形的情形時,尺寸檢測部103檢測該矩形的寬度及高度作為缺陷的寬度及高度。再者,尺寸檢測部103亦可將所檢測的寬度及高度換算為實際尺寸。In S4 (size detection step), the
S5中,尺寸檢測部103使S4中檢測的尺寸記憶於檢測結果記憶裝置4。具體而言,尺寸檢測部103向檢測結果記憶裝置4發送表示缺陷的寬度及高度的尺寸資訊並記憶。以上,針對S1中獲取的拍攝圖像的檢查步驟結束。In S5 , the
再者,雖圖4中未示,但圖4的檢查步驟反覆進行至對至少一片檢查對象的玻璃板的所有端面拍攝的拍攝圖像的檢查結束為止,然後回到圖3的製造步驟。Furthermore, although not shown in FIG. 4 , the inspection step in FIG. 4 is repeated until the inspection of the captured images of all end surfaces of at least one glass plate to be inspected is completed, and then returns to the manufacturing step in FIG. 3 .
而且,圖4的檢查步驟中,亦可包含下述步驟,即:對於對所有端面判定了有無缺陷的玻璃板,判定該玻璃板是良品還是不良品。該步驟中判定為良品的玻璃板成為製品。良品及不良品的判定基準只要適當決定即可。例如,亦可將檢測到既定尺寸以上的缺陷的玻璃板作為不良品,將未檢測到缺陷或所檢測到的缺陷小於既定尺寸的玻璃板作為良品。該判定可由檢查裝置1進行,亦可由與檢查裝置1不同的其他資訊處理裝置進行。Furthermore, the inspection step in FIG. 4 may include a step of determining whether the glass plate is a good product or a defective glass plate for which the presence or absence of defects has been determined for all end faces. The glass plate judged to be a good product in this step becomes a product. The criteria for judging a good product and a defective product may be appropriately determined. For example, a glass plate in which a defect larger than a predetermined size is detected may be regarded as a defective product, and a glass plate in which no defect is detected or a detected defect smaller than a predetermined size may be regarded as a good product. This determination may be performed by the
(作用、效果)
如以上般,本實施形態的檢查裝置1包括:圖像獲取部101,獲取拍攝玻璃板的端面所得的拍攝圖像。進而,檢查裝置1包括:尺寸檢測部103,檢測向尺寸檢測模型112輸入拍攝圖像所得的推論結果中的、所述範圍的尺寸,作為所拍攝的玻璃板所產生的缺陷的尺寸。此處,尺寸檢測模型112為以推論於端面產生的缺陷的位置及範圍的方式對該位置及範圍進行了學習的、學習完畢模型。
(Effect)
As mentioned above, the
而且,本實施形態的檢查方法如以上般,包括:圖像獲取步驟(S1),獲取拍攝玻璃板所得的拍攝圖像;以及尺寸檢測步驟(S4),檢測向尺寸檢測模型112輸入所述拍攝圖像所得的推論結果中的、範圍的尺寸,作為所拍攝的所述玻璃板所產生的缺陷的尺寸,所述尺寸檢測模型112為以推論玻璃板所產生的缺陷的位置及所述範圍的方式對該位置及範圍進行了學習的、學習完畢模型。Furthermore, the inspection method of this embodiment includes, as above, an image acquisition step (S1) of acquiring a photographed image obtained by photographing a glass plate; The size of the range in the inference result obtained from the image is taken as the size of the defect generated on the glass plate, and the
進而,本實施形態的玻璃板的製造方法如以上般,包括將玻璃原板成型為既定尺寸的玻璃板的步驟(S101)、及由檢查裝置1所執行的所述玻璃板的檢查步驟(S102),且所述檢查步驟包含:圖像獲取步驟(S1),獲取拍攝所述玻璃板所得的拍攝圖像;以及缺陷檢測步驟(S4),檢測向尺寸檢測模型112輸入所述拍攝圖像所得的推論結果中的、範圍的尺寸,作為所拍攝的所述玻璃板所產生的缺陷的尺寸,所述尺寸檢測模型112為以推論所述玻璃板所產生的缺陷的位置及所述範圍的方式對該位置及範圍進行了學習的、學習完畢模型。Furthermore, the method for manufacturing a glass plate according to the present embodiment includes the step of molding the original glass plate into a glass plate of a predetermined size ( S101 ), and the step of inspecting the glass plate by the inspection device 1 ( S102 ) as described above. , and the inspection step includes: an image acquisition step (S1) of acquiring a photographed image obtained by photographing the glass plate; In the deduction result, the size of the range is taken as the size of the defect generated in the glass plate, and the
根據該些結構,人不參與缺陷的尺寸檢測,故而可降低該檢測耗費的人力成本。而且,於尺寸檢測模型112的學習中,藉由將缺陷周邊的深淺不清晰的多數個圖像作為示教資料進行學習,從而由缺陷周邊的深淺不清晰的圖像亦可高精度地檢測缺陷。因此,可於玻璃板所產生的缺陷的尺寸檢測中,兼顧人力成本的降低與檢測精度的維持。According to these configurations, human beings are not involved in the size detection of defects, and thus the labor cost for the detection can be reduced. In addition, in the learning of the
〔實施形態2〕 以下對本發明的其他實施形態加以說明。再者,為方便說明,對於與所述實施形態中說明的構件具有相同功能的構件,標註相同符號,不重覆進行其說明。這一情況於實施形態3以後亦相同。 [Embodiment 2] Other embodiments of the present invention will be described below. In addition, for the convenience of description, the same code|symbol is attached|subjected to the member which has the same function as the member demonstrated in the said embodiment, and the description is not repeated. This is also the case in the third and subsequent embodiments.
本實施形態中,說明下述示例,即:尺寸檢測模型112基於與推論結果一併輸出的、所述推論結果的可靠度,檢測缺陷的尺寸。更詳細而言,本實施形態的尺寸檢測部103檢測所述可靠度為既定臨限值以上的推論結果中的、矩形的尺寸,作為所拍攝的玻璃板所產生的缺陷的尺寸。In this embodiment, an example will be described in which the
可靠度為表示推論結果的確率的值,作為一例,為0以上且1以下的數值。本實施形態的可靠度的數值越大,表示推論結果實際為缺陷的可能性越高。The reliability is a value indicating the certainty of an inference result, and is, for example, a numerical value ranging from 0 to 1. The larger the numerical value of the reliability in this embodiment, the higher the possibility that the inference result is actually a defect.
可靠度例如亦可對構成拍攝圖像的各畫素的畫素值進行數值分析而算出。拍攝圖像中,於有缺陷的區域與無缺陷的區域中,畫素值(深淺)大幅度地變化。因此,亦可於尺寸檢測模型112的推論結果所示的範圍的內部與外部的邊界的畫素值的變化量小的情形時降低可靠度,於畫素值的變化量大的情形時提高可靠度等,根據畫素值的變化量而算出可靠度。藉此,算出與畫素值的變化量對應的值的可靠度。而且,例如亦可使用與推論結果一併輸出表示該推論結果的可靠度的數值的、尺寸檢測模型112。於該情形時,無需數值分析等處理。The reliability may be calculated, for example, by numerically analyzing the pixel values of the pixels constituting the captured image. In the captured image, the pixel value (darkness) greatly changes between a defective area and a non-defective area. Therefore, the reliability can be lowered when the change amount of the pixel value at the boundary between the inside and outside of the range indicated by the inference result of the
(基於可靠度的尺寸檢測例)
圖5為表示基於可靠度的缺陷的尺寸檢測例的圖。圖5所示的拍攝圖像32於拍攝具有缺陷的玻璃板的端面所得的拍攝圖像中,描畫有表示尺寸檢測模型112的推論結果的矩形42~矩形44、及表示該些推論結果的可靠度的數值52~數值54。
(Example of dimension inspection based on reliability)
FIG. 5 is a diagram showing an example of dimension detection of defects based on reliability. In the photographed
如圖所示,本例中,尺寸檢測模型112推論出矩形42~矩形44分別表示的範圍為缺陷,該些推論的可靠度如數值52~數值54所示,分別為0.95、0.90及0.75。As shown in the figure, in this example, the
此處,例如設將可靠度的臨限值設定為0.80。於該情形時,尺寸檢測部103針對矩形42~矩形44中可靠度為0.80以上的矩形42及矩形43,檢測該些的尺寸分別作為缺陷的尺寸。另一方面,尺寸檢測部103針對可靠度小於0.80的矩形44,不檢測其尺寸作為缺陷的尺寸。Here, for example, it is assumed that the threshold value of reliability is set to 0.80. In this case, the
因此,若於拍攝圖像32上表示由尺寸檢測部103所得的最終的尺寸檢測的結果,則如圖5的下側所示,僅成為矩形42及矩形43。於該情形時,尺寸檢測部103向檢測結果記憶裝置4發送表示矩形42的寬度及高度的尺寸資訊、以及表示矩形43的寬度及高度的尺寸資訊並記憶。Therefore, when the final size detection result obtained by the
(檢查步驟的流程) 圖6為表示本實施形態的檢查步驟的一例的流程圖。再者,對於該流程圖中的、與圖4的流程圖相同的處理,標註與圖4相同的編號,不重覆進行其說明。 (Flow of checking steps) Fig. 6 is a flow chart showing an example of the inspection procedure in this embodiment. In this flowchart, the same processes as those in the flowchart of FIG. 4 are assigned the same numbers as those in FIG. 4 , and the description thereof will not be repeated.
S11中,尺寸檢測部103向S3中決定的尺寸檢測模型112輸入拍攝圖像21,獲取缺陷的尺寸的推論結果。該推論結果中,除了由尺寸檢測模型112推論為有缺陷的範圍的位置及尺寸以外,還包含該推論的可靠度。In S11, the
S12中,尺寸檢測部103檢測S11的推論中輸出的可靠度為臨限值以上的推論結果中的、範圍的尺寸,作為缺陷的尺寸。In S12, the
(作用、效果)
如以上般,本實施形態的檢查裝置1中,尺寸檢測模型112進而輸出針對推論結果的可靠度。而且,尺寸檢測部103檢測可靠度為既定臨限值以上的推論結果中的、缺陷的範圍的尺寸,作為所拍攝的玻璃板所產生的缺陷的尺寸。
(Effect)
As described above, in the
藉此,檢測可靠度高的推論結果中的範圍的尺寸作為缺陷的尺寸,故而即便對於無缺陷的部分作為推論結果獲得了位置及範圍,亦可降低將該範圍的尺寸誤檢測為缺陷的尺寸的可能性。In this way, the size of the range in the inference result with high reliability is detected as the size of the defect, so even if the position and range are obtained as the inference result for a non-defective part, the size of the range can be erroneously detected as the size of the defect. possibility.
尤其有時因玻璃板的搬送方向的偏差等而拍攝時的光的照射方式等改變,於無缺陷的部分亦產生色差。關於此種產生了色差的部分,有尺寸檢測模型112誤推論為缺陷部分的可能性,而藉由適當設定臨限值,從而可將製品的品質並無問題的色差部分與真正的缺陷部分區分,進行妥當的檢測。In particular, due to deviations in the conveyance direction of the glass plate, etc., the light irradiation method at the time of imaging may change, and chromatic aberration may also occur in a non-defective portion. With respect to such parts with color difference, there is a possibility that the
〔實施形態3〕
本實施形態的尺寸檢測部103於獲得多個推論結果的情形時,檢測包含該多個推論結果中的多個範圍的、區域的尺寸,作為所拍攝的玻璃板所產生的缺陷的尺寸。
[Embodiment 3]
When a plurality of inference results are obtained, the
圖7為表示本實施形態的尺寸檢測部103執行的缺陷的尺寸檢測的概要的圖。圖7所示的拍攝圖像33於拍攝包含缺陷部分的玻璃板的端面所得的拍攝圖像中,描畫有表示尺寸檢測模型112的推論結果的矩形45~矩形48。FIG. 7 is a diagram showing an overview of size detection of defects performed by the
本實施形態的尺寸檢測部103於如此於一個拍攝圖像中檢測到多個缺陷部分的範圍的情形時,求出包含該些範圍的最小區域的尺寸。例如,尺寸檢測部103亦可確定構成矩形45~矩形48的邊中位於最上側的邊、及矩形45~矩形48中位於最下側的邊,將該些邊之間的距離設為所求區域的高度。而且,尺寸檢測部103亦可確定構成矩形45~矩形48的邊中位於最左側的邊、及矩形45~矩形48中位於最右側的邊,將該些邊之間的距離設為所求區域的寬度。When the
尺寸檢測部103可藉由此種處理而確定包含矩形45~矩形48的包含區域61。繼而,尺寸檢測部103向檢測結果記憶裝置4發送表示包含區域61的寬度及高度的尺寸資訊並記憶。The
再者,圖7的示例中,確定包含互相接觸的矩形45~矩形48的包含區域61,但不限定於此。即,尺寸檢測部103亦可檢測包含互相不接觸的多個範圍的區域的尺寸,作為缺陷的尺寸。In addition, in the example of FIG. 7, the containing
所述結構例如於僅將實際的缺陷的兩端推論為缺陷,該缺陷的中央部分未被推論為缺陷的情形時有效。於該情形時,尺寸檢測部103可藉由確定包含所檢測的兩端的範圍的包含區域,從而檢測與該缺陷的實際尺寸的誤差小的包含區域的尺寸,作為缺陷的尺寸。This configuration is effective, for example, when only the two ends of the actual defect are inferred as defects, and the central portion of the defect is not inferred as a defect. In this case, the
(檢查步驟的流程) 圖8為表示本實施形態的檢查步驟的一例的流程圖。再者,對於該流程圖中的、與圖4的流程圖相同的處理,標註與圖4相同的編號。而且,對於與圖6的流程圖相同的處理,標註與圖6相同的編號。關於相同處理,不重覆進行說明。 (Flow of checking steps) Fig. 8 is a flow chart showing an example of the inspection procedure in this embodiment. In this flowchart, the same processes as those in the flowchart of FIG. 4 are assigned the same numbers as those in FIG. 4 . In addition, the same numbers as in FIG. 6 are assigned to the same processes as those in the flowchart of FIG. 6 . The description of the same processing will not be repeated.
S21中,尺寸檢測部103判定S11中獲取的推論結果是否為多個。於判定為多個的情形時(S21中為是(YES)),檢查步驟進入S22。另一方面,於判定為並非多個的情形時(S21中為否(NO)),檢查步驟進入S23。In S21, the
S22中,尺寸檢測部103求出包含S11中獲取的推論結果所示的多個範圍的、包含區域的尺寸,檢測其尺寸作為缺陷的尺寸。關於包含區域的尺寸的求出方法,如基於圖7所說明。In S22 , the
S23中,尺寸檢測部103檢測所獲取的推論結果中的範圍的尺寸作為缺陷的尺寸。即,尺寸檢測部103檢測S11中獲取的一個推論結果所示的寬度及高度作為缺陷的尺寸。In S23, the
(作用、效果)
如以上般,本實施形態的檢查裝置1中,尺寸檢測部103於獲得多個推論結果的情形時,檢測包含該多個推論結果中的多個範圍的、包含區域的尺寸,作為所拍攝的玻璃板所產生的缺陷的尺寸。
(Effect)
As described above, in the
根據所述結構,檢測包含區域的尺寸作為缺陷的尺寸,故而即便於獲得與實際缺陷的尺寸誤差大的多個範圍的情形時,亦可將該多個範圍修正為與實際缺陷的尺寸誤差小的包含區域。結果,即便於獲得多個範圍的情形時,亦可使利用尺寸檢測模型112的缺陷的尺寸檢測與實際尺寸的誤差更小。According to the above configuration, the size of the included region is detected as the size of the defect, so even when a plurality of ranges with a large size error from the actual defect are obtained, the ranges can be corrected so that the size error from the actual defect is small of the included area. As a result, even when a plurality of ranges are obtained, the error between the size detection of the defect using the
而且,於即便為檢測到多個缺陷的玻璃板,但所檢測的各缺陷的尺寸均小的情形時,有可能檢查裝置1最終將該玻璃板判定為良品。於缺陷的尺寸實際小的情形時該判定結果妥當,但於實際存在尺寸大的缺陷,且片斷地檢測出其一部分作為缺陷的情形時,該判定結果為誤判定。根據本實施形態的結構,可檢測包含多個缺陷的範圍的、包含區域的尺寸,故而可降低產生此種誤判定的可能性。Furthermore, even if it is a glass plate in which a plurality of defects are detected, the size of each detected defect is small, and the
(變形例)
本實施形態可與實施形態2組合。具體而言,尺寸檢測部103於有多個可靠度成為既定臨限值以上的推論結果的情形時,亦可確定包含該推論結果中的範圍的、包含區域,檢測該包含區域的尺寸作為所拍攝的玻璃板所產生的缺陷的尺寸。
(modified example)
This embodiment can be combined with
〔實施形態4〕
本實施形態的尺寸檢測部103於所檢測的缺陷的尺寸為正常範圍外的情形時,對構成拍攝圖像的各畫素的畫素進行數值分析,再次檢測該缺陷的尺寸。正常範圍例如只要以玻璃板的尺寸或通常的缺陷的尺寸等為基準而預先規定即可。正常範圍外的缺陷的尺寸例如可為滿足(1)作為推論結果的矩形的寬度為既定的第一數值範圍外、及(2)作為推論結果的矩形的高度為既定的第二數值範圍外的兩個條件中的至少任一個的尺寸。
[Embodiment 4]
When the
本實施形態的尺寸檢測部103亦與所述各實施形態的尺寸檢測部103同樣地,基於尺寸檢測模型112輸出的推論結果進行尺寸的檢測。本實施形態的尺寸檢測部103於判定所檢測的所述尺寸是否為正常範圍內的方面,與所述各實施形態的尺寸檢測部103不同。The
另外,本實施形態的尺寸檢測部103於所檢測的所述尺寸為正常範圍外的情形時,對構成拍攝圖像的各畫素的畫素值進行數值分析,再次檢測該缺陷的尺寸。本實施形態的尺寸檢測部103於該方面亦與所述各實施形態的尺寸檢測部103不同。再者,亦可將進行數值分析的處理塊設為與尺寸檢測部103不同的處理塊。In addition, when the detected size is out of the normal range, the
利用數值分析的缺陷的尺寸檢測方法並無特別限定,可適用各種方法。例如,如圖2等所示,於拍攝圖像中,於拍到玻璃板的端面的區域與其背景區域的邊界部分,畫素值大幅度地變化。因此,尺寸檢測部103亦可首先基於該畫素值的變化來提取拍到玻璃板的端面的區域。The size detection method of the defect by numerical analysis is not particularly limited, and various methods can be applied. For example, as shown in FIG. 2 and the like, in the captured image, the pixel value greatly changes at the boundary between the region where the end surface of the glass plate is captured and the background region. Therefore, the
而且,如圖2等所示,於拍攝圖像中拍到的玻璃板的端面中,拍到缺陷的部分的畫素值與並無缺陷的部分不同。因此,若如所述般提取的、拍到玻璃板的端面的區域中,含有包含拍到缺陷的部分所特有的畫素值的區域,則尺寸檢測部103只要檢測該區域的寬度及高度作為缺陷的尺寸即可。繼而,尺寸檢測部103向檢測結果記憶裝置4發送表示所檢測的寬度及高度的尺寸資訊並記憶。Furthermore, as shown in FIG. 2 and the like, among the end faces of the glass plate captured in the captured image, the pixel values of the portion where the defect is captured are different from those of the portion without the defect. Therefore, as long as the region including the pixel value specific to the portion where the defect is imaged is included in the region captured as described above and the end surface of the glass plate is extracted, the
(檢查步驟的流程) 圖9為表示本實施形態的檢查步驟的一例的流程圖。再者,對於該流程圖中的、與圖4的流程圖相同的處理,標註與圖4相同的編號,不重覆進行其說明。 (Flow of checking steps) FIG. 9 is a flow chart showing an example of the inspection procedure in this embodiment. In this flowchart, the same processes as those in the flowchart of FIG. 4 are assigned the same numbers as those in FIG. 4 , and the description thereof will not be repeated.
S31中,尺寸檢測部103判定S4中檢測的缺陷的尺寸是否為正常範圍內。於判定為正常範圍內的情形時(S31中為是(YES)),檢查步驟進入S5。於判定為並非正常範圍內、即正常範圍外的情形時(S31中為否(NO)),檢查步驟進入S32。In S31, the
S32中,尺寸檢測部103將基於尺寸檢測模型112所輸出的推論結果的、尺寸的檢測結果廢棄,S33中,尺寸檢測部103對構成拍攝圖像的各畫素的畫素值進行數值分析,再次檢測缺陷的尺寸。然後,檢查步驟進入S5。In S32, the
自S33進入的S5中,尺寸檢測部103亦可使表示執行了再次檢測的資訊與尺寸資訊關聯地記憶於檢測結果記憶裝置4。藉此,檢查系統100的用戶可確定進行了再次檢測的拍攝圖像。In S5 entered from S33 , the
而且,S32亦可省略。於該情形時,S5中,尺寸檢測部103使表示S4的檢測結果的尺寸資訊、及表示S33的檢測結果的尺寸資訊兩者記憶於檢測結果記憶裝置4。Moreover, S32 can also be omitted. In this case, in S5 , the
(作用、效果)
如以上般,本實施形態的檢查裝置1中,尺寸檢測部103於所檢測的缺陷的尺寸為正常範圍外的情形時,對構成拍攝圖像的各畫素的畫素值進行數值分析,再次檢測該缺陷的尺寸。
(Effect)
As described above, in the
根據所述結構,針對尺寸為正常範圍外的缺陷,對構成拍攝圖像的各畫素的畫素值進行數值分析而進行尺寸的再次檢測。即,利用與使用學習完畢模型1的缺陷的尺寸檢測不同的方法進行尺寸的再次檢測,故而可修正為適當的尺寸。According to the above configuration, for a defect whose size is out of the normal range, the pixel value of each pixel constituting the captured image is numerically analyzed to re-inspect the size. That is, since the re-inspection of the size is performed by a method different from the size detection of the defect using the learned
〔變形例〕 所述各實施形態中,對檢測於玻璃板的端面產生的缺陷的尺寸的示例進行了說明,但亦可檢測於玻璃板的端面以外的部分產生的缺陷的尺寸。而且,所述各實施形態中,對檢測自玻璃原板切出的玻璃板所產生的缺陷的尺寸的示例進行了說明,但成為對象的玻璃板不限於自玻璃原板切出。例如,亦可檢測包含玻璃板的製品中的玻璃板部分所產生的缺陷的尺寸等。 〔Modification〕 In each of the above-described embodiments, an example in which the size of the defect generated on the end surface of the glass plate was detected was described, but the size of the defect generated on a portion other than the end surface of the glass plate may also be detected. Furthermore, in each of the above-described embodiments, an example of detecting the size of a defect generated in a glass sheet cut out from a glass original sheet has been described, but the target glass sheet is not limited to cutting out from a glass original sheet. For example, it is also possible to detect the size and the like of a defect generated in a glass plate portion of a product including a glass plate.
而且,所述各實施形態中,表示了藉由一台檢查裝置進行有無缺陷(及種類)的判定與尺寸的檢測兩者的示例,但該些處理亦可分別由不同裝置進行。即,所述各實施形態中說明的檢查方法可由一台檢查裝置執行,亦可由多台檢查裝置執行。Furthermore, in each of the above-described embodiments, an example was shown in which both determination of the presence or absence of defects (and type) and detection of dimensions were performed by one inspection device, but these processes may be performed by separate devices. That is, the inspection method described in each of the above-mentioned embodiments may be executed by one inspection device, or may be executed by a plurality of inspection devices.
而且,所述各實施形態中,對將缺陷判定模型111及尺寸檢測模型112分別設為不同模型的示例進行了說明,但亦可使用學習了有無缺陷與缺陷的位置及範圍的一個模型。於該情形時,若向該一個模型輸入拍攝圖像,則輸出表示有無缺陷的推論結果。而且,於有缺陷的情形時,亦一併輸出表示其位置及範圍的推論結果。而且,亦可使該一個模型針對缺陷的種類進行推論。Furthermore, in each of the above-described embodiments, an example in which the
〔藉由軟體的實現例〕 檢查裝置1(以下稱為「裝置」)的功能可藉由下述程式(檢查程式)實現,該程式用於使電腦作為所述裝置發揮功能,並且用於使電腦作為所述裝置的各控制塊(尤其是控制部10所含的各部)發揮功能。 〔Example of realization by software〕 The function of the inspection device 1 (hereinafter referred to as "device") can be realized by the following program (inspection program) for making a computer function as the device and for controlling each of the devices as the computer. The blocks (in particular, each unit included in the control unit 10 ) function.
於該情形時,所述裝置包括電腦,所述電腦具有至少一個控制裝置(例如處理器)及至少一個記憶裝置(例如記憶體)作為用以執行所述程式的硬體。藉由利用該控制裝置及記憶裝置執行所述程式,從而實現所述各實施形態中說明的各功能。In this case, the device includes a computer having at least one control device (such as a processor) and at least one storage device (such as a memory) as hardware for executing the program. Each function described in each of the above-described embodiments is realized by executing the program using the control device and the storage device.
所述程式亦可記錄於非暫時性且電腦可讀取的一個或多個記錄媒體。該記錄媒體可由所述裝置包括,亦可不包括。後者的情形時,所述程式亦可經由有線或無線的任意的傳輸媒體供給於所述裝置。The program can also be recorded in one or more non-transitory and computer-readable recording media. The recording medium may or may not be included by the device. In the latter case, the program may be supplied to the device via any wired or wireless transmission medium.
而且,所述各控制塊的功能的一部分或全部亦可藉由邏輯迴路而實現。例如,形成有作為所述各控制塊發揮功能的邏輯迴路的積體電路亦包含於本發明的範疇。除此以外,例如亦可藉由量子電腦而實現所述各控制塊的功能。 而且,包括以下結構的電腦程式產品亦包含於本發明的範疇。即,本發明的一態樣的電腦程式產品經由電腦加載(load)檢查程式,且執行下述命令:使處理器獲取拍攝玻璃板所得的拍攝圖像;以及使所述處理器檢測向學習完畢模型輸入所述拍攝圖像所得的推論結果中的、範圍的尺寸,作為所拍攝的所述玻璃板所產生的缺陷的尺寸,所述學習完畢模型以推論玻璃板所產生的缺陷的位置及所述範圍的方式,對該位置及範圍進行了學習。 Moreover, part or all of the functions of the control blocks may be realized by logic circuits. For example, an integrated circuit in which a logic circuit functioning as each of the above-mentioned control blocks is formed is also included in the scope of the present invention. In addition, for example, the functions of the control blocks can also be realized by a quantum computer. Furthermore, computer program products including the following configurations are also included in the scope of the present invention. That is, the computer program product of one aspect of the present invention loads (loads) the inspection program via the computer, and executes the following commands: causing the processor to acquire a captured image obtained by capturing a glass plate; The model inputs the size of the range in the inference result obtained from the photographed image as the size of the defect generated on the glass plate captured, and the learned model is used to deduce the position of the defect generated on the glass plate and the size of the defect generated on the glass plate. The position and the range are studied in the manner of the above-mentioned range.
本發明不限定於所述各實施形態,可於申請專利範圍所示的範圍進行各種變更,將不同實施形態分別揭示的技術手段適當組合所得的實施形態亦包含於本發明的技術範圍。The present invention is not limited to the above-mentioned embodiments, and various changes can be made within the range indicated in the patent claims. Embodiments obtained by appropriately combining the technical means disclosed in different embodiments are also included in the technical scope of the present invention.
1:檢查裝置
2:攝像裝置
3:圖像記憶裝置
4:檢測結果記憶裝置
10:控制部
11:記憶部
12:通訊部
21、32、33:拍攝圖像
31:圖像
41~48:矩形
52~54:數值
61:包含區域
100:檢查系統
101:圖像獲取部
102:缺陷判定部
103:尺寸檢測部
111:缺陷判定模型
112:尺寸檢測模型
S1~S5、S11、S12、S21~S23、S31~S33、S101、S102:步驟
1: Check the device
2: camera device
3: Image memory device
4: Test result memory device
10: Control Department
11: Memory Department
12: Department of
圖1為表示本發明的實施形態1的檢查系統的概要、及檢查系統所含的檢查裝置的要部結構的一例的區塊圖。
圖2為表示利用尺寸檢測模型的、缺陷的位置及範圍的推論例的圖。
圖3為表示伴有由所述檢查裝置進行的檢查的、玻璃板的製造步驟的一例的流程圖。
圖4為表示所述製造步驟所含的檢查步驟的一例的流程圖。
圖5為表示基於可靠度的缺陷的尺寸檢測例的圖。
圖6為表示本發明的實施形態2的檢查步驟的一例的流程圖。
圖7為表示本發明的實施形態3的尺寸檢測部執行的缺陷的尺寸檢測的概要的圖。
圖8為表示本發明的實施形態3的檢查步驟的一例的流程圖。
圖9為表示本發明的實施形態4的檢查步驟的一例的流程圖。
FIG. 1 is a block diagram showing an overview of an inspection system according to
1:檢查裝置 1: Check the device
2:攝像裝置 2: camera device
3:圖像記憶裝置 3: Image memory device
4:檢測結果記憶裝置 4: Test result memory device
10:控制部 10: Control Department
11:記憶部 11: Memory Department
12:通訊部 12: Department of Communications
100:檢查系統 100: Check system
101:圖像獲取部 101: Image Acquisition Department
102:缺陷判定部 102:Defect Judgment Department
103:尺寸檢測部 103: Size inspection department
111:缺陷判定模型 111: Defect Judgment Model
112:尺寸檢測模型 112: Dimensional detection model
Claims (10)
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JP2021095236A JP2022187282A (en) | 2021-06-07 | 2021-06-07 | Inspection device, inspection method, glass plate manufacturing method, and inspection program |
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JP (1) | JP2022187282A (en) |
KR (1) | KR20240017773A (en) |
CN (1) | CN116997769A (en) |
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JP3013903B2 (en) * | 1991-01-31 | 2000-02-28 | セントラル硝子株式会社 | Defect detection device for sheet glass |
KR100817131B1 (en) * | 2002-03-15 | 2008-03-27 | 엘지.필립스 엘시디 주식회사 | Apparatus and method for testing liquid crystal display panel |
KR20040079352A (en) | 2004-07-28 | 2004-09-14 | 이성환 | High frequency hair medical treatment and vision system |
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