TW202248628A - Inspection device, inspection method, manufacturing method of glass plates, inspection program, and computer program product - Google Patents

Inspection device, inspection method, manufacturing method of glass plates, inspection program, and computer program product Download PDF

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TW202248628A
TW202248628A TW111119580A TW111119580A TW202248628A TW 202248628 A TW202248628 A TW 202248628A TW 111119580 A TW111119580 A TW 111119580A TW 111119580 A TW111119580 A TW 111119580A TW 202248628 A TW202248628 A TW 202248628A
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glass plate
defect
inspection
range
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茗原貴裕
植村弥浩
三成泰紀
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日商日本電氣硝子股份有限公司
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/30Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958Inspecting transparent materials or objects, e.g. windscreens
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • G06T7/0004Industrial image inspection
    • G06T7/001Industrial image inspection using an image reference approach
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854Grading and classifying of flaws
    • G01N2021/8858Flaw counting
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854Grading and classifying of flaws
    • G01N2021/8861Determining coordinates of flaws
    • G01N2021/8864Mapping zones of defects
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8883Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges involving the calculation of gauges, generating models
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques

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  • Quality & Reliability (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
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  • Length Measuring Devices By Optical Means (AREA)

Abstract

The present invention strikes a balance between a reduction in personnel costs of detecting the size of a flaw generated in a glass plate and maintenance of detection accuracy. An inspection device (1) includes: an image acquisition unit (101) that obtains an acquired image of a glass plate; and a size detection unit (103) that inputs the acquired image to a size detection model (112), which has learned so as to infer the position and a range of a flaw generated in the glass plate, and that detects the size of the range in an obtained inference result, as the size of the flaw.

Description

檢查裝置、檢查方法、玻璃板的製造方法、檢查程式以及電腦程式產品Inspection device, inspection method, glass plate manufacturing method, inspection program, and computer program product

本發明是有關於一種檢查裝置等,基於拍攝玻璃板所得的圖像來進行玻璃板的缺陷檢查。The present invention relates to an inspection device and the like for inspecting defects of a glass plate based on an image obtained by taking a glass plate.

先前,玻璃板的製造中的玻璃板的缺陷檢查、尤其是玻璃板所產生的缺陷的尺寸檢測是藉由目視而進行,因而不可避免地產生人力成本。針對所述問題,於專利文獻1揭示有下述技術,即:對拍攝玻璃板的端面所得的圖像進行圖像處理,進行缺陷的尺寸檢測。 [現有技術文獻] [專利文獻] Conventionally, defect inspection of glass sheets in the manufacture of glass sheets, especially size inspection of defects generated in glass sheets, was performed by visual inspection, and thus labor costs were inevitably incurred. In view of such a problem, Patent Document 1 discloses a technique of performing image processing on an image obtained by capturing an end surface of a glass plate to detect the size of a defect. [Prior art literature] [Patent Document]

[專利文獻1]國際公開第2004/079352號公報[Patent Document 1] International Publication No. 2004/079352

[發明所欲解決之課題] 於如上所述的先前技術中,本申請案的發明者等人發現了下述問題,即:有時無法以充分的精度檢測缺陷的尺寸等。關於所述問題,可認為下述情況成為一個原因,即:於拍攝玻璃板所得的圖像中,缺陷周邊的深淺大多不清晰。 [Problem to be Solved by the Invention] In the prior art as described above, the inventors of the present application found a problem that the size and the like of a defect may not be detected with sufficient accuracy. One of the causes of the above-mentioned problems is considered to be that the depth of the periphery of the defect is often unclear in the image obtained by capturing the glass plate.

本發明的目的在於提供一種檢查裝置等,可於玻璃板所產生的缺陷的尺寸檢測中,兼顧人力成本的降低與檢測精度的維持。 [解決課題之手段] The object of the present invention is to provide an inspection device, etc., which can balance the reduction of labor costs and the maintenance of detection accuracy in the size detection of defects generated in glass plates. [Means to solve the problem]

為了解決所述課題,本發明的一態樣的檢查裝置包括:圖像獲取部,獲取拍攝玻璃板所得的拍攝圖像;以及尺寸檢測部,檢測向學習完畢模型輸入所述拍攝圖像所得的推論結果中的、範圍的尺寸,作為所拍攝的所述玻璃板所產生的缺陷的尺寸,所述學習完畢模型以推論玻璃板所產生的缺陷的位置及所述範圍的方式,對所述位置及範圍進行了學習。In order to solve the above-mentioned problems, an inspection device according to an aspect of the present invention includes: an image acquisition unit that acquires a captured image of a glass plate; In the inference result, the size of the range is taken as the size of the defect generated on the glass plate, and the learned model calculates the position of the defect generated on the glass plate and the range. and scope were studied.

為了解決所述課題,本發明的一態樣的檢查方法是由檢查裝置所執行,且包括:圖像獲取步驟,獲取拍攝玻璃板所得的拍攝圖像;以及尺寸檢測步驟,檢測向學習完畢模型輸入所述拍攝圖像所得的推論結果中的、範圍的尺寸,作為所拍攝的所述玻璃板所產生的缺陷的尺寸,所述學習完畢模型以推論玻璃板所產生的缺陷的位置及所述範圍的方式,對所述位置及範圍進行了學習。In order to solve the above-mentioned problems, an inspection method according to an aspect of the present invention is performed by an inspection device, and includes: an image acquisition step of acquiring a captured image obtained by photographing a glass plate; and a size detection step of detecting a learned model. The size of the range in the inference result obtained by the captured image is input as the size of the defect generated on the glass plate captured, and the learned model is used to infer the position of the defect generated on the glass plate and the The location and range are learned in a range-based manner.

為了解決所述課題,本發明的一態樣的玻璃板的製造方法包含:將玻璃原板成型為既定尺寸的玻璃板的步驟、以及由檢查裝置所執行的所述玻璃板的檢查步驟,並且所述檢查步驟包含:圖像獲取步驟,獲取拍攝所述玻璃板所得的拍攝圖像;以及尺寸檢測步驟,檢測向學習完畢模型輸入所述拍攝圖像所得的推論結果中的、範圍的尺寸,作為所拍攝的所述玻璃板所產生的缺陷的尺寸,所述學習完畢模型以推論所述玻璃板所產生的缺陷的位置及所述範圍的方式,對所述位置及範圍進行了學習。 [發明的效果] In order to solve the above-mentioned problems, a method for manufacturing a glass plate according to an aspect of the present invention includes a step of molding an original glass plate into a glass plate of a predetermined size, and an inspection step of the glass plate performed by an inspection device, and the The inspection step includes: an image acquisition step of acquiring a photographed image of the glass plate; and a size detection step of detecting the size of a range in an inference result obtained by inputting the photographed image to the learned model as The size of the defect generated on the glass plate is imaged, and the learned model learns the position and range of the defect generated on the glass plate so as to infer the position and range of the defect generated on the glass plate. [Effect of the invention]

根據本發明的一態樣,可於玻璃板所產生的缺陷的尺寸檢測中,兼顧人力成本的降低與檢測精度的維持。According to an aspect of the present invention, in the dimension detection of the defect generated in the glass plate, both the reduction of labor cost and the maintenance of detection accuracy can be taken into account.

[實施形態1] (檢查系統100) 以下,對本發明的一實施形態加以詳細說明。圖1為表示本實施形態的檢查系統100的概要、及檢查系統100所含的檢查裝置1的要部結構的一例的區塊圖。 [Embodiment 1] (check system 100) Hereinafter, an embodiment of the present invention will be described in detail. FIG. 1 is a block diagram showing an overview of an inspection system 100 according to the present embodiment and an example of a configuration of main parts of an inspection device 1 included in the inspection system 100 .

檢查系統100為檢測於玻璃板的端面產生的缺陷的尺寸的系統。再者,本實施形態中,設玻璃板為矩形狀而進行說明,但玻璃板的形狀不限定於該例。所謂缺陷,例如為於玻璃板的端面產生的破裂、缺損等。檢查系統100包含檢查裝置1、攝像裝置2、圖像記憶裝置3及檢測結果記憶裝置4。The inspection system 100 is a system for detecting the size of a defect generated on an end surface of a glass sheet. In addition, in this embodiment, although the glass plate is demonstrated as a rectangular shape, the shape of a glass plate is not limited to this example. The so-called defects are, for example, cracks, chipping, etc. generated on the end surfaces of the glass plate. The inspection system 100 includes an inspection device 1 , an imaging device 2 , an image memory device 3 and a test result memory device 4 .

檢查裝置1為檢測於玻璃板的端面產生的缺陷的尺寸的裝置。對於玻璃板的端面,先前藉由目視進行缺陷的尺寸檢測,而且,使用圖像處理的尺寸檢測有時因拍攝圖像中的缺陷周邊的深淺不清晰而難以進行正確的尺寸檢測。雖然詳細情況將於後述,但檢查裝置1檢測向學習完畢模型輸入拍攝圖像所得的缺陷的推論結果中的、範圍的尺寸,作為缺陷的尺寸,所述學習完畢模型以推論於端面產生的缺陷的位置及範圍的方式進行了學習。即,人不參與端面的缺陷的尺寸檢測,故而可降低該檢測耗費的人力成本。而且,於該學習完畢模型的學習中,藉由將缺陷周邊的深淺不清晰的端面的圖像作為示教資料進行多數次學習,從而由缺陷周邊的深淺不清晰的端面的圖像亦可高精度地檢測缺陷。因此,可於玻璃板的端面所產生的缺陷的尺寸檢測中,兼顧人力成本的降低與檢測精度的維持。The inspection apparatus 1 is an apparatus which detects the size of the defect which arises in the end surface of a glass plate. For the end face of a glass plate, the size inspection of defects has been performed visually, and in the size inspection using image processing, it may be difficult to perform accurate size inspection because the depth of the periphery of the defect in the captured image is not clear. Although the details will be described later, the inspection device 1 detects, as the size of the defect, the size of a range in the inference result of the defect obtained by inputting the captured image to the learned model that infers the defect generated on the end surface. The location and scope of the method are studied. That is, since human beings are not involved in the dimensional inspection of the defect on the end surface, the labor cost required for this inspection can be reduced. Furthermore, in the learning of the learned model, by using the images of the blurred end faces around the defects as teaching materials for many times of learning, the images of the dark and dark end faces around the defects can also be highly improved. Detect defects with precision. Therefore, in the size detection of the defect generated on the end surface of the glass plate, both the reduction of labor cost and the maintenance of detection accuracy can be taken into account.

攝像裝置2為拍攝玻璃板的端面的裝置。此處,所謂端面,為將玻璃板的最廣的兩面分別設為上面、下面時的側面部分,亦可稱為外周部。下文中,有時將玻璃板的四個端面分別表述為X1端面、X2端面、Y1端面及Y2端面。再者,設X1端面與X2端面為互相平行的端面,Y1端面與Y2端面為互相平行的端面。The imaging device 2 is a device for imaging the end surface of the glass plate. Here, the term "end surface" refers to a side surface part when the widest both surfaces of the glass plate are set as an upper surface and a lower surface, respectively, and may also be referred to as an outer peripheral part. Hereinafter, the four end surfaces of the glass plate may be respectively expressed as an X1 end surface, an X2 end surface, a Y1 end surface, and a Y2 end surface. Furthermore, let the X1 end surface and the X2 end surface be mutually parallel end surfaces, and the Y1 end surface and the Y2 end surface be mutually parallel end surfaces.

作為一例,攝像裝置2配置於沿著搬送玻璃板的搬送裝置(未圖示)的搬送路徑的位置,以既定的時間間隔連續拍攝由搬送裝置進行搬送中的玻璃板的一個端面。如此,藉由對一個端面進行多次拍攝,從而可獲得將一個端面分割為多個的多個拍攝圖像,而且可使各拍攝圖像的端面的解析度高至充分進行檢查的程度。當然,若即便由一次拍攝來拍攝一個端面整體亦可獲得充分解析度的拍攝圖像,則拍攝次數可為一次。As an example, the imaging device 2 is arranged along a conveying path of a conveying device (not shown) that conveys a glass plate, and continuously images one end surface of a glass plate being conveyed by the conveying device at predetermined time intervals. In this manner, by taking multiple shots of one end face, a plurality of captured images in which one end face is divided into a plurality can be obtained, and the resolution of the end face of each captured image can be sufficiently high for inspection. Of course, if a captured image with sufficient resolution can be obtained even if the entire end surface is captured by one capture, the number of captures may be one.

於圖1僅圖示一個攝像裝置2,但攝像裝置2亦可針對玻璃板的每個端面設置。例如,亦可將兩個攝像裝置2以隔著搬送路徑彼此相向的方式配置,同時拍攝互相平行的端面(例如X1端面與X2端面、或Y1端面與Y2端面)。而且,於搬送路徑分支的情形時,亦可於每個分支配置攝像裝置2。Only one camera device 2 is shown in FIG. 1 , but the camera device 2 can also be arranged for each end face of the glass plate. For example, two imaging devices 2 may be arranged so as to face each other across the conveyance path, and simultaneously image parallel end faces (for example, X1 end face and X2 end face, or Y1 end face and Y2 end face). Moreover, when the conveyance path branches, the imaging device 2 may be arrange|positioned for every branch.

而且,雖圖示省略,但可於攝像裝置2隨附有照明裝置及資訊處理裝置,一方面藉由照明裝置向玻璃板的端面照射光,一方面藉由攝像裝置2拍攝端面。Moreover, although the illustration is omitted, the imaging device 2 may be accompanied by an illumination device and an information processing device. On the one hand, the illumination device irradiates light to the end surface of the glass plate, and on the other hand, the imaging device 2 takes pictures of the end surface.

所述資訊處理裝置為對攝像裝置2拍攝的拍攝圖像賦予附加資訊並記憶於圖像記憶裝置3的裝置。附加資訊中,包含表示拍攝圖像中拍到的玻璃板的玻璃識別資訊、及表示所述拍攝圖像中拍到的是玻璃板的哪一部分的玻璃位置資訊。The information processing device is a device that adds additional information to the captured image captured by the imaging device 2 and stores it in the image memory device 3 . The additional information includes glass identification information indicating the glass plate captured in the captured image, and glass position information indicating which part of the glass plate is captured in the captured image.

玻璃識別資訊例如亦可為對各玻璃板賦予的識別編號。玻璃位置資訊只要為表示玻璃板的哪一部分的資訊即可。例如,於玻璃板的搬送速度為一定,端面每一處的拍攝次數亦為一定的情形時,亦可將表示為由哪次拍攝所得的拍攝圖像的資訊作為玻璃位置資訊。The glass identification information may be, for example, an identification number given to each glass plate. The glass position information only needs to be information indicating what part of the glass plate is. For example, when the conveying speed of the glass plate is constant and the number of photographs taken at each position of the end surface is also constant, the information indicating which photographed image was obtained may be used as the glass position information.

圖像記憶裝置3為記憶攝像裝置2拍攝的拍攝圖像的記憶裝置。而且,檢測結果記憶裝置4為記憶檢查裝置1所檢測的檢測結果、即表示缺陷的尺寸的資訊的記憶裝置。再者,圖像記憶裝置3及檢測結果記憶裝置4亦可分別設置多個。例如,亦可針對玻璃板的每個端面設置圖像記憶裝置3及檢測結果記憶裝置4。而且,亦可省略圖像記憶裝置3及檢測結果記憶裝置4。此時,只要使攝像裝置2向檢查裝置1發生拍攝圖像,使檢查裝置1將檢測結果記憶於記憶部11即可。The image memory device 3 is a memory device for storing captured images captured by the imaging device 2 . Furthermore, the detection result storage device 4 is a storage device that stores the detection result detected by the inspection device 1 , that is, information indicating the size of a defect. Furthermore, multiple image memory devices 3 and test result memory devices 4 may be provided respectively. For example, an image memory device 3 and a test result memory device 4 may also be provided for each end surface of the glass plate. Furthermore, the image storage device 3 and the detection result storage device 4 may also be omitted. In this case, it is only necessary to cause the imaging device 2 to generate a captured image to the inspection device 1 and cause the inspection device 1 to store the detection result in the storage unit 11 .

(檢查裝置1) 檢查裝置1如圖1所示,包括控制部10、記憶部11及通訊部12。控制部10綜合控制檢查裝置1的各部。記憶部11記憶檢查裝置1使用的各種資料。通訊部12用於檢查裝置1與其他裝置進行通訊。該其他裝置的典型例為圖像記憶裝置3及檢測結果記憶裝置4。 (check device 1) As shown in FIG. 1 , the inspection device 1 includes a control unit 10 , a memory unit 11 and a communication unit 12 . The control unit 10 comprehensively controls each unit of the inspection device 1 . The storage unit 11 stores various data used by the inspection device 1 . The communication unit 12 is used for the inspection device 1 to communicate with other devices. Typical examples of these other devices are the image memory device 3 and the detection result memory device 4 .

控制部10如圖1所示,包含圖像獲取部101、缺陷判定部102及尺寸檢測部103。記憶部11記憶缺陷判定模型111及尺寸檢測模型112。As shown in FIG. 1 , the control unit 10 includes an image acquisition unit 101 , a defect determination unit 102 , and a size detection unit 103 . The memory unit 11 memorizes a defect determination model 111 and a size detection model 112 .

圖像獲取部101獲取拍攝玻璃板所得的拍攝圖像。本實施形態中,圖像獲取部101獲取的拍攝圖像如上文所述,為攝像裝置2拍攝玻璃板的端面所得的拍攝圖像。作為一例,圖像獲取部101自圖像記憶裝置3經由通訊部12接收拍攝圖像。The image acquisition part 101 acquires the captured image which captured the glass plate. In the present embodiment, the captured image acquired by the image acquiring unit 101 is a captured image obtained by imaging the end surface of the glass plate by the imaging device 2 as described above. As an example, the image acquisition unit 101 receives captured images from the image memory device 3 via the communication unit 12 .

缺陷判定部102判定拍攝圖像中拍到的端面中有無缺陷。具體而言,缺陷判定部102向缺陷判定模型111輸入自圖像獲取部101獲取的拍攝圖像,基於自缺陷判定模型111輸出的推論結果判定有無缺陷。The defect determination unit 102 determines whether or not there is a defect in the end surface captured in the captured image. Specifically, the defect determination unit 102 inputs the captured image acquired from the image acquisition unit 101 to the defect determination model 111 , and determines the presence or absence of a defect based on the inference result output from the defect determination model 111 .

此處,對缺陷判定模型111加以說明。缺陷判定模型111為以推論拍攝玻璃板的端面所得的拍攝圖像中有無缺陷的方式進行了學習的、學習完畢模型。此種缺陷判定模型111是藉由將已知有無缺陷的多數個拍攝圖像作為示教資料的機器學習而構建。關於機器學習的算法,只要可生成能將拍攝圖像分類為有缺陷與無缺陷兩種的、缺陷判定模型111即可,並無特別限定。例如,圖像的分類精度高的、深度學習的卷積類神經網路(convolution neural network)等合適,但不限於該例。Here, the defect determination model 111 will be described. The defect judgment model 111 is a learned model that has been learned so as to infer whether there is a defect in the captured image obtained by capturing the end surface of the glass plate. Such a defect determination model 111 is constructed by machine learning using a plurality of captured images whose presence or absence of defects is known as teaching data. The machine learning algorithm is not particularly limited as long as it can generate the defect determination model 111 capable of classifying captured images into two types of defective and non-defective. For example, a deep learning convolutional neural network (convolution neural network) with high image classification accuracy is suitable, but it is not limited to this example.

而且,缺陷判定部102亦可針對缺陷的種類進行判定。於亦進行針對缺陷的種類的判定的情形時,只要針對缺陷的每個種類準備示教資料,進行使用該些示教資料的機器學習即可。作為缺陷的種類,例如可列舉上文所述的破裂、缺損等。In addition, the defect determination unit 102 may determine the type of defect. When the determination is also performed for the type of defect, it is only necessary to prepare teaching data for each type of defect and perform machine learning using the teaching data. Examples of types of defects include cracks, chips, and the like described above.

尺寸檢測部103檢測向尺寸檢測模型112輸入拍攝圖像所得的推論結果中的、缺陷的範圍的尺寸,作為所拍攝的玻璃板所產生的缺陷的尺寸。The dimension detection part 103 detects the dimension of the range of a defect in the inference result which inputted the captured image to the dimension detection model 112, as the dimension of the defect which arises in the captured glass plate.

此處,對尺寸檢測模型112加以說明。尺寸檢測模型112為以推論玻璃板所產生的缺陷的位置及範圍的方式,對該位置及範圍進行了學習的學習完畢模型。此種,尺寸檢測模型112可藉由使用下述示教資料的機器學習而構建,所述示教資料針對拍到缺陷的拍攝圖像,使所述缺陷的位置及範圍作為正解資料進行了關聯。缺陷的位置及範圍例如亦可由包圍該缺陷的矩形表示。於該情形時,該矩形的位置表示缺陷的位置,該矩形的寬度及高度表示缺陷的範圍即尺寸。Here, the size detection model 112 will be described. The size inspection model 112 is a learned model that has learned the position and range of a defect generated in a glass plate so as to infer the position and range. In this way, the size detection model 112 can be constructed by machine learning using teaching data that correlates the position and range of the defect as positive solution data with respect to the captured image of the defect. . The position and range of a defect can also be represented by, for example, a rectangle surrounding the defect. In this case, the position of the rectangle indicates the position of the defect, and the width and height of the rectangle indicate the size of the defect.

作為所述示教資料,較佳為使用缺陷周邊的深淺不清晰的多數個拍攝圖像。藉此,由缺陷周邊的深淺不清晰的拍攝圖像亦可高精度地檢測缺陷的尺寸。機器學習的算法與缺陷判定模型111同樣地,並無特別限定。As the teaching data, it is preferable to use a plurality of captured images in which the shades of the periphery of the defect are not clear. Thereby, the size of the defect can be detected with high precision even from the photographed image with blurred shades around the defect. The algorithm of machine learning is not particularly limited in the same way as the defect determination model 111 .

而且,於缺陷判定部102判定缺陷的種類的情形時,亦可針對缺陷的每個種類預先準備尺寸檢測模型112,尺寸檢測部103利用與缺陷判定部102所判定的種類相應的尺寸檢測模型112來進行尺寸檢測。藉此,可提高尺寸的檢測精度。例如,亦可將拍攝產生破裂的玻璃板的端面所得的拍攝圖像作為示教資料,構建破裂缺陷用的尺寸檢測模型112,並且將拍攝產生缺損的玻璃板的端面所得的拍攝圖像作為示教資料,構建缺損缺陷用的尺寸檢測模型112。於該情形時,針對缺陷判定部102判定為產生破裂缺陷的拍攝圖像,只要使用破裂缺陷用的尺寸檢測模型112進行尺寸檢測即可。另一方面,針對缺陷判定部102判定為產生缺損缺陷的拍攝圖像,只要使用缺損缺陷用的尺寸檢測模型112進行尺寸檢測即可。Furthermore, when the defect judging unit 102 judges the type of defect, the size detection model 112 may be prepared in advance for each type of defect, and the size detection unit 103 may use the size detection model 112 corresponding to the type judged by the defect judging unit 102. for size inspection. Thereby, the detection accuracy of a dimension can be improved. For example, it is also possible to use the photographed image obtained by photographing the end surface of the glass plate with cracks as teaching data, construct the size detection model 112 for crack defects, and use the photographed image obtained by photographing the end surface of the glass plate with defects as a demonstration material. Teaching materials, constructing the size detection model 112 for defect defects. In this case, it is only necessary to perform size detection using the size detection model 112 for the crack defect with respect to the captured image determined by the defect judging unit 102 to have a crack defect. On the other hand, what is necessary is just to perform size detection using the size detection model 112 for chip|tip defect with respect to the captured image judged by the defect determination part 102 that a chip defect has arisen.

(推論例) 圖2為表示利用尺寸檢測模型112的缺陷的位置及範圍的推論例的圖。本例中,攝像裝置2拍攝玻璃板的端面所得的圖像為拍攝圖像21。於拍攝圖像21的中央部沿橫向延伸的黑色部分為玻璃板的端面,玻璃板的端面中央部附近所拍到的白色部分為缺陷。如上文所述,拍攝圖像21記憶於圖像記憶裝置3。 (inference example) FIG. 2 is a diagram showing an example of inference of the position and range of a defect using the dimension inspection model 112 . In this example, the image obtained by imaging the end surface of the glass plate by the imaging device 2 is the captured image 21 . The black portion extending laterally in the central portion of the captured image 21 is the end face of the glass plate, and the white portion photographed near the central portion of the end face of the glass plate is a defect. As described above, the captured image 21 is stored in the image memory device 3 .

檢查裝置1的圖像獲取部101自圖像記憶裝置3獲取所述拍攝圖像21。若獲取拍攝圖像21,則首先缺陷判定部102將拍攝圖像21輸入至缺陷判定模型111,基於自缺陷判定模型111輸出的推論結果判定有無缺陷。拍攝圖像21中如上所述般拍到缺陷,故而缺陷判定部102判定為有缺陷。再者,如上所述,缺陷判定部102亦可針對缺陷的種類進行判定,但此處僅判定有無缺陷。The image acquisition unit 101 of the inspection device 1 acquires the captured image 21 from the image storage device 3 . When the captured image 21 is acquired, first, the defect determination unit 102 inputs the captured image 21 to the defect determination model 111 , and determines the presence or absence of a defect based on an inference result output from the defect determination model 111 . Since a defect is captured in the captured image 21 as described above, the defect determination unit 102 determines that there is a defect. Furthermore, as described above, the defect judging unit 102 may also judge the type of defect, but here it only judges the presence or absence of a defect.

針對缺陷判定部102判定為有缺陷的拍攝圖像21,由尺寸檢測部103進行尺寸的檢測。即,尺寸檢測部103向尺寸檢測模型112輸入拍攝圖像21,獲取尺寸檢測模型112輸出的推論結果。所述推論結果表示拍攝圖像21中的缺陷的位置及範圍。The size detection unit 103 detects the size of the captured image 21 determined to be defective by the defect determination unit 102 . That is, the size detection unit 103 inputs the captured image 21 to the size detection model 112 and acquires the inference result output from the size detection model 112 . The inference result indicates the position and range of the defect in the captured image 21 .

尺寸檢測部103使所述推論結果所示的範圍作為表示缺陷尺寸的尺寸資訊記憶於檢測結果記憶裝置4。例如於所述範圍為矩形的情形時,尺寸檢測部103只要使拍攝圖像21中的表示該矩形的位置的代表座標(例如矩形的左上角的座標)、以及表示該矩形的寬度及高度的尺寸資訊記憶即可。The size detection unit 103 stores the range indicated by the above-mentioned deduction result in the detection result storage device 4 as size information indicating the defect size. For example, when the range is a rectangle, the size detection unit 103 only needs to set the representative coordinates (for example, the coordinates of the upper left corner of the rectangle) representing the position of the rectangle in the captured image 21, and the coordinates representing the width and height of the rectangle. The size information can be memorized.

圖2所示的圖像31中,以矩形41表示尺寸檢測模型112的推論結果。如圖所示,矩形41的寬度及高度與缺陷的寬度及高度相等,由此可知進行了準確的推論。In the image 31 shown in FIG. 2 , the inference result of the size detection model 112 is indicated by a rectangle 41 . As shown in the figure, the width and height of the rectangle 41 are equal to the width and height of the defect, and thus it can be seen that an accurate inference has been made.

此種矩形亦可稱為註解(annotation)。藉由顯示註解,從而可使檢查裝置1的用戶目視確認推論結果。藉由使用由將拍到缺陷的拍攝圖像作為示教資料的機器學習所構建的尺寸檢測模型112,從而可如此準確地檢測缺陷部分。Such rectangles may also be called annotations. By displaying the comment, the user of the inspection device 1 can visually confirm the inference result. By using the size detection model 112 constructed by machine learning using the captured image of the defect as teaching data, it is possible to detect the defective portion so accurately.

(玻璃板的製造步驟中的檢查) 由檢查裝置1進行的檢查亦可作為玻璃板的製造步驟的一環而進行。此時,基於圖3對伴有由檢查裝置1進行的檢查的、玻璃板的製造步驟例加以說明。圖3為表示伴有由檢查裝置1進行的檢查的、玻璃板的製造步驟的一例的流程圖。 (Inspection in manufacturing steps of glass plate) The inspection by the inspection apparatus 1 can also be performed as a part of the manufacturing process of a glass plate. At this time, an example of a manufacturing procedure of a glass plate accompanied by inspection by the inspection device 1 will be described based on FIG. 3 . FIG. 3 is a flowchart showing an example of a manufacturing procedure of a glass plate accompanied by inspection by the inspection device 1 .

S101中,將玻璃原板成型為既定尺寸的玻璃板。玻璃原板為較成為製品的玻璃板更為大型的尺寸的玻璃板,藉由玻璃原板的製造裝置而製造。S101中,玻璃原板例如藉由將該玻璃原板切斷為既定尺寸的切斷裝置、及對切斷後的玻璃板的端面進行加工的加工裝置而調整為既定尺寸的玻璃板。In S101, the original glass plate is molded into a glass plate of a predetermined size. The original glass plate is a glass plate of a larger size than the glass plate to be a product, and is manufactured by a glass original plate manufacturing device. In S101, the original glass plate is adjusted to a glass plate of a predetermined size by, for example, a cutting device that cuts the original glass plate into a predetermined size, and a processing device that processes the end surface of the cut glass plate.

S102中,檢查裝置1執行檢查步驟。由該檢查步驟判定為良品的玻璃板成為製品。以下基於圖4對檢查步驟的詳細加以說明。In S102, the inspection device 1 executes an inspection step. The glass plate judged to be a good product by this inspection process becomes a product. The details of the inspection procedure will be described below based on FIG. 4 .

(檢查步驟的流程) 圖4為表示圖3所示的檢查步驟的一例的流程圖。再者,設檢查步驟開始前,攝像裝置2拍攝檢查對象的玻璃板的端面,並將其拍攝圖像記憶於圖像記憶裝置3。而且,執行圖4所示的檢查步驟的時機並無特別限定。例如,可於每當拍攝新圖像並記憶於圖像記憶裝置3時進行,亦可每當一片玻璃板的一個端面的拍攝結束時進行,亦可於檢查對象的所有玻璃板的所有端面的拍攝結束後進行。 (Flow of checking steps) FIG. 4 is a flowchart showing an example of the inspection procedure shown in FIG. 3 . Furthermore, it is assumed that before the inspection step starts, the imaging device 2 photographs the end face of the glass plate to be inspected, and stores the photographed image in the image memory device 3 . Furthermore, the timing for performing the inspection step shown in FIG. 4 is not particularly limited. For example, it can be carried out every time a new image is taken and stored in the image memory device 3, it can also be carried out every time the shooting of one end surface of a glass plate is completed, and it can also be carried out on all end surfaces of all glass plates of the inspection object. Carried out after shooting.

S1(圖像獲取步驟)中,圖像獲取部101自圖像記憶裝置3獲取拍攝圖像。於圖像記憶裝置3記憶有多個拍攝圖像的情形時,只要獲取尚未供於檢查步驟的拍攝圖像即可。繼而,圖像獲取部101向缺陷判定部102輸出所獲取的拍攝圖像。In S1 (image acquisition step), the image acquisition unit 101 acquires a captured image from the image memory device 3 . When a plurality of captured images are stored in the image memory device 3, it is only necessary to acquire captured images that have not yet been submitted to the inspection step. Then, the image acquisition unit 101 outputs the acquired captured image to the defect determination unit 102 .

S2中,缺陷判定部102將S1中獲取的拍攝圖像輸入至缺陷判定模型111,基於自缺陷判定模型111輸出的推論結果來判定有無缺陷。而且,此處設缺陷判定部102亦對缺陷的種類進行判定。In S2, the defect determination part 102 inputs the captured image acquired in S1 to the defect determination model 111, and determines the presence or absence of a defect based on the inference result output from the defect determination model 111. In addition, it is assumed here that the defect determination unit 102 also determines the type of the defect.

S3中,尺寸檢測部103決定將預先記憶於記憶部11的多個尺寸檢測模型中與S2中判定的缺陷的種類對應的尺寸檢測模型112用於尺寸檢測。再者,於S2中判定為無缺陷的情形時,不進行S3以後的處理,針對S1中獲取的拍攝圖像的檢查步驟結束。In S3, the dimension detection part 103 decides to use the dimension detection model 112 corresponding to the kind of defect judged in S2 among the some dimension detection models memorize|stored in the storage part 11 beforehand, for dimension detection. In addition, when it is determined in S2 that there is no defect, the process after S3 is not performed, and the inspection procedure for the captured image acquired in S1 ends.

S4(尺寸檢測步驟)中,尺寸檢測部103向S3中決定的尺寸檢測模型112輸入S1中獲取的拍攝圖像。繼而,尺寸檢測部103檢測自尺寸檢測模型112輸出的推論結果中的、範圍的尺寸(換言之,推論結果所示的範圍的大小),作為缺陷的尺寸。例如,於所述範圍為矩形的情形時,尺寸檢測部103檢測該矩形的寬度及高度作為缺陷的寬度及高度。再者,尺寸檢測部103亦可將所檢測的寬度及高度換算為實際尺寸。In S4 (size detection step), the size detection unit 103 inputs the captured image acquired in S1 to the size detection model 112 determined in S3 . Next, the size detection unit 103 detects the size of the range (in other words, the size of the range indicated by the inference result) in the inference result output from the size detection model 112 as the size of the defect. For example, when the said range is a rectangle, the size detection part 103 detects the width and height of this rectangle as the width and height of a defect. Furthermore, the size detecting unit 103 may also convert the detected width and height into actual sizes.

S5中,尺寸檢測部103使S4中檢測的尺寸記憶於檢測結果記憶裝置4。具體而言,尺寸檢測部103向檢測結果記憶裝置4發送表示缺陷的寬度及高度的尺寸資訊並記憶。以上,針對S1中獲取的拍攝圖像的檢查步驟結束。In S5 , the size detection unit 103 stores the size detected in S4 in the detection result storage device 4 . Specifically, the dimension detection unit 103 transmits and stores dimension information indicating the width and height of a defect to the detection result storage device 4 . As above, the inspection procedure for the captured image acquired in S1 ends.

再者,雖圖4中未示,但圖4的檢查步驟反覆進行至對至少一片檢查對象的玻璃板的所有端面拍攝的拍攝圖像的檢查結束為止,然後回到圖3的製造步驟。Furthermore, although not shown in FIG. 4 , the inspection step in FIG. 4 is repeated until the inspection of the captured images of all end surfaces of at least one glass plate to be inspected is completed, and then returns to the manufacturing step in FIG. 3 .

而且,圖4的檢查步驟中,亦可包含下述步驟,即:對於對所有端面判定了有無缺陷的玻璃板,判定該玻璃板是良品還是不良品。該步驟中判定為良品的玻璃板成為製品。良品及不良品的判定基準只要適當決定即可。例如,亦可將檢測到既定尺寸以上的缺陷的玻璃板作為不良品,將未檢測到缺陷或所檢測到的缺陷小於既定尺寸的玻璃板作為良品。該判定可由檢查裝置1進行,亦可由與檢查裝置1不同的其他資訊處理裝置進行。Furthermore, the inspection step in FIG. 4 may include a step of determining whether the glass plate is a good product or a defective glass plate for which the presence or absence of defects has been determined for all end faces. The glass plate judged to be a good product in this step becomes a product. The criteria for judging a good product and a defective product may be appropriately determined. For example, a glass plate in which a defect larger than a predetermined size is detected may be regarded as a defective product, and a glass plate in which no defect is detected or a detected defect smaller than a predetermined size may be regarded as a good product. This determination may be performed by the inspection device 1 , or may be performed by another information processing device different from the inspection device 1 .

(作用、效果) 如以上般,本實施形態的檢查裝置1包括:圖像獲取部101,獲取拍攝玻璃板的端面所得的拍攝圖像。進而,檢查裝置1包括:尺寸檢測部103,檢測向尺寸檢測模型112輸入拍攝圖像所得的推論結果中的、所述範圍的尺寸,作為所拍攝的玻璃板所產生的缺陷的尺寸。此處,尺寸檢測模型112為以推論於端面產生的缺陷的位置及範圍的方式對該位置及範圍進行了學習的、學習完畢模型。 (Effect) As mentioned above, the inspection apparatus 1 of this embodiment includes the image acquisition part 101 which acquires the image|captured image which image|photographed the end surface of a glass plate. Furthermore, the inspection device 1 includes a size detection unit 103 that detects the size of the above-mentioned range in the inference result obtained by inputting the captured image to the size detection model 112 as the size of the defect generated in the captured glass plate. Here, the dimension inspection model 112 is a learned model that has learned the position and range of the defect generated on the end surface so as to infer the position and range.

而且,本實施形態的檢查方法如以上般,包括:圖像獲取步驟(S1),獲取拍攝玻璃板所得的拍攝圖像;以及尺寸檢測步驟(S4),檢測向尺寸檢測模型112輸入所述拍攝圖像所得的推論結果中的、範圍的尺寸,作為所拍攝的所述玻璃板所產生的缺陷的尺寸,所述尺寸檢測模型112為以推論玻璃板所產生的缺陷的位置及所述範圍的方式對該位置及範圍進行了學習的、學習完畢模型。Furthermore, the inspection method of this embodiment includes, as above, an image acquisition step (S1) of acquiring a photographed image obtained by photographing a glass plate; The size of the range in the inference result obtained from the image is taken as the size of the defect generated on the glass plate, and the size detection model 112 is used to deduce the position of the defect generated on the glass plate and the size of the range The method has learned the position and the range, and the learned model is completed.

進而,本實施形態的玻璃板的製造方法如以上般,包括將玻璃原板成型為既定尺寸的玻璃板的步驟(S101)、及由檢查裝置1所執行的所述玻璃板的檢查步驟(S102),且所述檢查步驟包含:圖像獲取步驟(S1),獲取拍攝所述玻璃板所得的拍攝圖像;以及缺陷檢測步驟(S4),檢測向尺寸檢測模型112輸入所述拍攝圖像所得的推論結果中的、範圍的尺寸,作為所拍攝的所述玻璃板所產生的缺陷的尺寸,所述尺寸檢測模型112為以推論所述玻璃板所產生的缺陷的位置及所述範圍的方式對該位置及範圍進行了學習的、學習完畢模型。Furthermore, the method for manufacturing a glass plate according to the present embodiment includes the step of molding the original glass plate into a glass plate of a predetermined size ( S101 ), and the step of inspecting the glass plate by the inspection device 1 ( S102 ) as described above. , and the inspection step includes: an image acquisition step (S1) of acquiring a photographed image obtained by photographing the glass plate; In the deduction result, the size of the range is taken as the size of the defect generated in the glass plate, and the size detection model 112 is used to deduce the position and the range of the defect generated in the glass plate. The position and the range are learned, and the learned model is completed.

根據該些結構,人不參與缺陷的尺寸檢測,故而可降低該檢測耗費的人力成本。而且,於尺寸檢測模型112的學習中,藉由將缺陷周邊的深淺不清晰的多數個圖像作為示教資料進行學習,從而由缺陷周邊的深淺不清晰的圖像亦可高精度地檢測缺陷。因此,可於玻璃板所產生的缺陷的尺寸檢測中,兼顧人力成本的降低與檢測精度的維持。According to these configurations, human beings are not involved in the size detection of defects, and thus the labor cost for the detection can be reduced. In addition, in the learning of the size inspection model 112, by learning a large number of images with unclear shades around defects as teaching data, defects can be detected with high accuracy even from images with unclear shades around defects. . Therefore, the reduction of labor costs and the maintenance of detection accuracy can be taken into account during the size detection of the defects generated in the glass plate.

〔實施形態2〕 以下對本發明的其他實施形態加以說明。再者,為方便說明,對於與所述實施形態中說明的構件具有相同功能的構件,標註相同符號,不重覆進行其說明。這一情況於實施形態3以後亦相同。 [Embodiment 2] Other embodiments of the present invention will be described below. In addition, for the convenience of description, the same code|symbol is attached|subjected to the member which has the same function as the member demonstrated in the said embodiment, and the description is not repeated. This is also the case in the third and subsequent embodiments.

本實施形態中,說明下述示例,即:尺寸檢測模型112基於與推論結果一併輸出的、所述推論結果的可靠度,檢測缺陷的尺寸。更詳細而言,本實施形態的尺寸檢測部103檢測所述可靠度為既定臨限值以上的推論結果中的、矩形的尺寸,作為所拍攝的玻璃板所產生的缺陷的尺寸。In this embodiment, an example will be described in which the dimension inspection model 112 detects the dimension of a defect based on the reliability of the inference result output together with the inference result. More specifically, the size detection unit 103 of the present embodiment detects the size of a rectangle in the inference result whose reliability is equal to or greater than a predetermined threshold value, as the size of a defect generated in the captured glass plate.

可靠度為表示推論結果的確率的值,作為一例,為0以上且1以下的數值。本實施形態的可靠度的數值越大,表示推論結果實際為缺陷的可能性越高。The reliability is a value indicating the certainty of an inference result, and is, for example, a numerical value ranging from 0 to 1. The larger the numerical value of the reliability in this embodiment, the higher the possibility that the inference result is actually a defect.

可靠度例如亦可對構成拍攝圖像的各畫素的畫素值進行數值分析而算出。拍攝圖像中,於有缺陷的區域與無缺陷的區域中,畫素值(深淺)大幅度地變化。因此,亦可於尺寸檢測模型112的推論結果所示的範圍的內部與外部的邊界的畫素值的變化量小的情形時降低可靠度,於畫素值的變化量大的情形時提高可靠度等,根據畫素值的變化量而算出可靠度。藉此,算出與畫素值的變化量對應的值的可靠度。而且,例如亦可使用與推論結果一併輸出表示該推論結果的可靠度的數值的、尺寸檢測模型112。於該情形時,無需數值分析等處理。The reliability may be calculated, for example, by numerically analyzing the pixel values of the pixels constituting the captured image. In the captured image, the pixel value (darkness) greatly changes between a defective area and a non-defective area. Therefore, the reliability can be lowered when the change amount of the pixel value at the boundary between the inside and outside of the range indicated by the inference result of the size detection model 112 is small, and the reliability can be improved when the change amount of the pixel value is large. degree, etc., and the reliability is calculated from the amount of change in the pixel value. Thereby, the reliability of the value corresponding to the change amount of the pixel value is calculated. Furthermore, for example, the size detection model 112 that outputs a numerical value indicating the reliability of the inference result together with the inference result may be used. In this case, processing such as numerical analysis is unnecessary.

(基於可靠度的尺寸檢測例) 圖5為表示基於可靠度的缺陷的尺寸檢測例的圖。圖5所示的拍攝圖像32於拍攝具有缺陷的玻璃板的端面所得的拍攝圖像中,描畫有表示尺寸檢測模型112的推論結果的矩形42~矩形44、及表示該些推論結果的可靠度的數值52~數值54。 (Example of dimension inspection based on reliability) FIG. 5 is a diagram showing an example of dimension detection of defects based on reliability. In the photographed image 32 shown in FIG. 5 , rectangles 42 to 44 representing the inference results of the size inspection model 112 and the reliability of these inference results are drawn in the photographed image obtained by photographing the end face of the glass plate with defects. The value of degree is 52~54.

如圖所示,本例中,尺寸檢測模型112推論出矩形42~矩形44分別表示的範圍為缺陷,該些推論的可靠度如數值52~數值54所示,分別為0.95、0.90及0.75。As shown in the figure, in this example, the size detection model 112 deduces that the ranges indicated by the rectangles 42 to 44 are defects, and the reliability of these inferences are 0.95, 0.90 and 0.75 as shown by the values 52 to 54, respectively.

此處,例如設將可靠度的臨限值設定為0.80。於該情形時,尺寸檢測部103針對矩形42~矩形44中可靠度為0.80以上的矩形42及矩形43,檢測該些的尺寸分別作為缺陷的尺寸。另一方面,尺寸檢測部103針對可靠度小於0.80的矩形44,不檢測其尺寸作為缺陷的尺寸。Here, for example, it is assumed that the threshold value of reliability is set to 0.80. In this case, the dimension detection part 103 detects the dimension of the rectangle 42 and the rectangle 43 whose reliability is 0.80 or more among the rectangle 42-rectangle 44, respectively, as the dimension of a defect. On the other hand, the size detection unit 103 does not detect the size of the rectangle 44 whose reliability is less than 0.80 as the size of the defect.

因此,若於拍攝圖像32上表示由尺寸檢測部103所得的最終的尺寸檢測的結果,則如圖5的下側所示,僅成為矩形42及矩形43。於該情形時,尺寸檢測部103向檢測結果記憶裝置4發送表示矩形42的寬度及高度的尺寸資訊、以及表示矩形43的寬度及高度的尺寸資訊並記憶。Therefore, when the final size detection result obtained by the size detection unit 103 is displayed on the captured image 32, only the rectangle 42 and the rectangle 43 are shown on the lower side of FIG. 5 . In this case, the size detection unit 103 transmits and stores the size information indicating the width and height of the rectangle 42 and the size information indicating the width and height of the rectangle 43 to the detection result storage device 4 .

(檢查步驟的流程) 圖6為表示本實施形態的檢查步驟的一例的流程圖。再者,對於該流程圖中的、與圖4的流程圖相同的處理,標註與圖4相同的編號,不重覆進行其說明。 (Flow of checking steps) Fig. 6 is a flow chart showing an example of the inspection procedure in this embodiment. In this flowchart, the same processes as those in the flowchart of FIG. 4 are assigned the same numbers as those in FIG. 4 , and the description thereof will not be repeated.

S11中,尺寸檢測部103向S3中決定的尺寸檢測模型112輸入拍攝圖像21,獲取缺陷的尺寸的推論結果。該推論結果中,除了由尺寸檢測模型112推論為有缺陷的範圍的位置及尺寸以外,還包含該推論的可靠度。In S11, the size detection part 103 inputs the captured image 21 to the size detection model 112 determined in S3, and acquires the deduction result of the size of a defect. This inference result includes not only the position and size of the range inferred to be defective by the size detection model 112 but also the reliability of the inference.

S12中,尺寸檢測部103檢測S11的推論中輸出的可靠度為臨限值以上的推論結果中的、範圍的尺寸,作為缺陷的尺寸。In S12, the size detection part 103 detects the size of the range in the inference result in which the reliability output in the inference of S11 is more than a threshold value, as the size of a defect.

(作用、效果) 如以上般,本實施形態的檢查裝置1中,尺寸檢測模型112進而輸出針對推論結果的可靠度。而且,尺寸檢測部103檢測可靠度為既定臨限值以上的推論結果中的、缺陷的範圍的尺寸,作為所拍攝的玻璃板所產生的缺陷的尺寸。 (Effect) As described above, in the inspection device 1 of the present embodiment, the dimension detection model 112 further outputs the reliability of the inference result. And the size detection part 103 detects the size of the range of a defect in the inference result whose reliability is more than a predetermined threshold value, as the size of the defect which arises in the imaged glass plate.

藉此,檢測可靠度高的推論結果中的範圍的尺寸作為缺陷的尺寸,故而即便對於無缺陷的部分作為推論結果獲得了位置及範圍,亦可降低將該範圍的尺寸誤檢測為缺陷的尺寸的可能性。In this way, the size of the range in the inference result with high reliability is detected as the size of the defect, so even if the position and range are obtained as the inference result for a non-defective part, the size of the range can be erroneously detected as the size of the defect. possibility.

尤其有時因玻璃板的搬送方向的偏差等而拍攝時的光的照射方式等改變,於無缺陷的部分亦產生色差。關於此種產生了色差的部分,有尺寸檢測模型112誤推論為缺陷部分的可能性,而藉由適當設定臨限值,從而可將製品的品質並無問題的色差部分與真正的缺陷部分區分,進行妥當的檢測。In particular, due to deviations in the conveyance direction of the glass plate, etc., the light irradiation method at the time of imaging may change, and chromatic aberration may also occur in a non-defective portion. With respect to such parts with color difference, there is a possibility that the size detection model 112 may mistakenly deduce that it is a defective part, and by properly setting the threshold value, it is possible to distinguish the color difference part that has no problem with the quality of the product from the real defect part , for proper detection.

〔實施形態3〕 本實施形態的尺寸檢測部103於獲得多個推論結果的情形時,檢測包含該多個推論結果中的多個範圍的、區域的尺寸,作為所拍攝的玻璃板所產生的缺陷的尺寸。 [Embodiment 3] When a plurality of inference results are obtained, the size detection unit 103 of the present embodiment detects the size of a region including a plurality of ranges in the plurality of inference results as the size of a defect generated in the captured glass plate.

圖7為表示本實施形態的尺寸檢測部103執行的缺陷的尺寸檢測的概要的圖。圖7所示的拍攝圖像33於拍攝包含缺陷部分的玻璃板的端面所得的拍攝圖像中,描畫有表示尺寸檢測模型112的推論結果的矩形45~矩形48。FIG. 7 is a diagram showing an overview of size detection of defects performed by the size detection unit 103 according to the present embodiment. In the photographed image 33 shown in FIG. 7 , rectangles 45 to 48 representing the inference results of the size detection model 112 are drawn in the photographed image obtained by photographing the end face of the glass plate including the defective portion.

本實施形態的尺寸檢測部103於如此於一個拍攝圖像中檢測到多個缺陷部分的範圍的情形時,求出包含該些範圍的最小區域的尺寸。例如,尺寸檢測部103亦可確定構成矩形45~矩形48的邊中位於最上側的邊、及矩形45~矩形48中位於最下側的邊,將該些邊之間的距離設為所求區域的高度。而且,尺寸檢測部103亦可確定構成矩形45~矩形48的邊中位於最左側的邊、及矩形45~矩形48中位於最右側的邊,將該些邊之間的距離設為所求區域的寬度。When the size detection unit 103 of this embodiment detects a range of a plurality of defective parts in one captured image in this way, it obtains the size of the smallest area including these ranges. For example, the size detecting unit 103 may also determine the uppermost side among the sides constituting the rectangle 45 to the rectangle 48, and the lowermost side among the rectangles 45 to 48, and set the distance between these sides to the desired The height of the area. Moreover, the size detecting unit 103 may also determine the leftmost side among the sides constituting the rectangle 45 to the rectangle 48 and the rightmost side among the rectangles 45 to 48, and set the distance between these sides as the desired area width.

尺寸檢測部103可藉由此種處理而確定包含矩形45~矩形48的包含區域61。繼而,尺寸檢測部103向檢測結果記憶裝置4發送表示包含區域61的寬度及高度的尺寸資訊並記憶。The size detection unit 103 can determine the inclusion area 61 including the rectangle 45 to rectangle 48 through such processing. Next, the size detection unit 103 sends and stores size information indicating the width and height of the included region 61 to the detection result storage device 4 .

再者,圖7的示例中,確定包含互相接觸的矩形45~矩形48的包含區域61,但不限定於此。即,尺寸檢測部103亦可檢測包含互相不接觸的多個範圍的區域的尺寸,作為缺陷的尺寸。In addition, in the example of FIG. 7, the containing area 61 containing the mutually contacting rectangle 45 - the rectangle 48 is specified, but it is not limited to this. That is, the size detection unit 103 may detect the size of a region including a plurality of ranges not in contact with each other as the size of the defect.

所述結構例如於僅將實際的缺陷的兩端推論為缺陷,該缺陷的中央部分未被推論為缺陷的情形時有效。於該情形時,尺寸檢測部103可藉由確定包含所檢測的兩端的範圍的包含區域,從而檢測與該缺陷的實際尺寸的誤差小的包含區域的尺寸,作為缺陷的尺寸。This configuration is effective, for example, when only the two ends of the actual defect are inferred as defects, and the central portion of the defect is not inferred as a defect. In this case, the size detection unit 103 can detect the size of the inclusion area with a small error from the actual size of the defect as the size of the defect by specifying the inclusion area including the detected both ends.

(檢查步驟的流程) 圖8為表示本實施形態的檢查步驟的一例的流程圖。再者,對於該流程圖中的、與圖4的流程圖相同的處理,標註與圖4相同的編號。而且,對於與圖6的流程圖相同的處理,標註與圖6相同的編號。關於相同處理,不重覆進行說明。 (Flow of checking steps) Fig. 8 is a flow chart showing an example of the inspection procedure in this embodiment. In this flowchart, the same processes as those in the flowchart of FIG. 4 are assigned the same numbers as those in FIG. 4 . In addition, the same numbers as in FIG. 6 are assigned to the same processes as those in the flowchart of FIG. 6 . The description of the same processing will not be repeated.

S21中,尺寸檢測部103判定S11中獲取的推論結果是否為多個。於判定為多個的情形時(S21中為是(YES)),檢查步驟進入S22。另一方面,於判定為並非多個的情形時(S21中為否(NO)),檢查步驟進入S23。In S21, the size detection unit 103 determines whether there are a plurality of inference results acquired in S11. When it is determined that there are a plurality of items (YES in S21 ), the checking procedure proceeds to S22 . On the other hand, when it is determined that there are not a plurality of cases (NO in S21), the checking procedure proceeds to S23.

S22中,尺寸檢測部103求出包含S11中獲取的推論結果所示的多個範圍的、包含區域的尺寸,檢測其尺寸作為缺陷的尺寸。關於包含區域的尺寸的求出方法,如基於圖7所說明。In S22 , the size detection unit 103 obtains the size of a region including a plurality of ranges indicated by the inference result acquired in S11 , and detects the size as the size of a defect. The method of calculating the size of the included region is as described based on FIG. 7 .

S23中,尺寸檢測部103檢測所獲取的推論結果中的範圍的尺寸作為缺陷的尺寸。即,尺寸檢測部103檢測S11中獲取的一個推論結果所示的寬度及高度作為缺陷的尺寸。In S23, the size detection unit 103 detects the size of the range in the acquired inference result as the size of the defect. That is, the size detection unit 103 detects the width and height indicated by one of the inference results acquired in S11 as the size of the defect.

(作用、效果) 如以上般,本實施形態的檢查裝置1中,尺寸檢測部103於獲得多個推論結果的情形時,檢測包含該多個推論結果中的多個範圍的、包含區域的尺寸,作為所拍攝的玻璃板所產生的缺陷的尺寸。 (Effect) As described above, in the inspection device 1 according to the present embodiment, when a plurality of inference results are obtained, the size detection unit 103 detects the size of a region including a plurality of ranges among the plurality of inference results as the captured image. The size of the defect produced by the glass sheet.

根據所述結構,檢測包含區域的尺寸作為缺陷的尺寸,故而即便於獲得與實際缺陷的尺寸誤差大的多個範圍的情形時,亦可將該多個範圍修正為與實際缺陷的尺寸誤差小的包含區域。結果,即便於獲得多個範圍的情形時,亦可使利用尺寸檢測模型112的缺陷的尺寸檢測與實際尺寸的誤差更小。According to the above configuration, the size of the included region is detected as the size of the defect, so even when a plurality of ranges with a large size error from the actual defect are obtained, the ranges can be corrected so that the size error from the actual defect is small of the included area. As a result, even when a plurality of ranges are obtained, the error between the size detection of the defect using the size detection model 112 and the actual size can be made smaller.

而且,於即便為檢測到多個缺陷的玻璃板,但所檢測的各缺陷的尺寸均小的情形時,有可能檢查裝置1最終將該玻璃板判定為良品。於缺陷的尺寸實際小的情形時該判定結果妥當,但於實際存在尺寸大的缺陷,且片斷地檢測出其一部分作為缺陷的情形時,該判定結果為誤判定。根據本實施形態的結構,可檢測包含多個缺陷的範圍的、包含區域的尺寸,故而可降低產生此種誤判定的可能性。Furthermore, even if it is a glass plate in which a plurality of defects are detected, the size of each detected defect is small, and the inspection apparatus 1 may finally determine the glass plate as a good product. This judgment result is correct when the size of the defect is actually small, but it is an incorrect judgment when there is actually a large-sized defect and a part of it is detected as a defect fragmentarily. According to the configuration of the present embodiment, the size of the included region, which includes a range including a plurality of defects, can be detected, so the possibility of such misjudgment can be reduced.

(變形例) 本實施形態可與實施形態2組合。具體而言,尺寸檢測部103於有多個可靠度成為既定臨限值以上的推論結果的情形時,亦可確定包含該推論結果中的範圍的、包含區域,檢測該包含區域的尺寸作為所拍攝的玻璃板所產生的缺陷的尺寸。 (modified example) This embodiment can be combined with Embodiment 2. Specifically, when there are a plurality of inference results whose reliability is equal to or higher than a predetermined threshold, the size detection unit 103 may specify an included area including a range in the inferred result, and detect the size of the included area as the inferred area. The size of the defect produced by the photographed glass sheet.

〔實施形態4〕 本實施形態的尺寸檢測部103於所檢測的缺陷的尺寸為正常範圍外的情形時,對構成拍攝圖像的各畫素的畫素進行數值分析,再次檢測該缺陷的尺寸。正常範圍例如只要以玻璃板的尺寸或通常的缺陷的尺寸等為基準而預先規定即可。正常範圍外的缺陷的尺寸例如可為滿足(1)作為推論結果的矩形的寬度為既定的第一數值範圍外、及(2)作為推論結果的矩形的高度為既定的第二數值範圍外的兩個條件中的至少任一個的尺寸。 [Embodiment 4] When the size detection unit 103 of the present embodiment detects that the size of the defect is out of the normal range, it performs numerical analysis on the pixels constituting each pixel of the captured image, and detects the size of the defect again. The normal range should just be predetermined based on the size of a glass plate, the size of a normal defect, etc., for example. The size of the defect outside the normal range may satisfy (1) the width of the rectangle as the inference result is outside the predetermined first numerical range, and (2) the height of the rectangle as the inference result is outside the predetermined second numerical range. Dimensions of at least either of the two conditions.

本實施形態的尺寸檢測部103亦與所述各實施形態的尺寸檢測部103同樣地,基於尺寸檢測模型112輸出的推論結果進行尺寸的檢測。本實施形態的尺寸檢測部103於判定所檢測的所述尺寸是否為正常範圍內的方面,與所述各實施形態的尺寸檢測部103不同。The size detection unit 103 of the present embodiment also detects a size based on the inference result output from the size detection model 112, similarly to the size detection unit 103 of each of the aforementioned embodiments. The size detection unit 103 of this embodiment is different from the size detection unit 103 of each of the above-mentioned embodiments in determining whether or not the detected size is within a normal range.

另外,本實施形態的尺寸檢測部103於所檢測的所述尺寸為正常範圍外的情形時,對構成拍攝圖像的各畫素的畫素值進行數值分析,再次檢測該缺陷的尺寸。本實施形態的尺寸檢測部103於該方面亦與所述各實施形態的尺寸檢測部103不同。再者,亦可將進行數值分析的處理塊設為與尺寸檢測部103不同的處理塊。In addition, when the detected size is out of the normal range, the size detection unit 103 of this embodiment performs numerical analysis on the pixel values of each pixel constituting the captured image, and detects the size of the defect again. The size detection unit 103 of this embodiment is also different from the size detection unit 103 of each of the above-mentioned embodiments in this point. In addition, the processing block for performing numerical analysis may be a processing block different from that of the size detection unit 103 .

利用數值分析的缺陷的尺寸檢測方法並無特別限定,可適用各種方法。例如,如圖2等所示,於拍攝圖像中,於拍到玻璃板的端面的區域與其背景區域的邊界部分,畫素值大幅度地變化。因此,尺寸檢測部103亦可首先基於該畫素值的變化來提取拍到玻璃板的端面的區域。The size detection method of the defect by numerical analysis is not particularly limited, and various methods can be applied. For example, as shown in FIG. 2 and the like, in the captured image, the pixel value greatly changes at the boundary between the region where the end surface of the glass plate is captured and the background region. Therefore, the size detection unit 103 may firstly extract the region captured on the end surface of the glass plate based on the change in the pixel value.

而且,如圖2等所示,於拍攝圖像中拍到的玻璃板的端面中,拍到缺陷的部分的畫素值與並無缺陷的部分不同。因此,若如所述般提取的、拍到玻璃板的端面的區域中,含有包含拍到缺陷的部分所特有的畫素值的區域,則尺寸檢測部103只要檢測該區域的寬度及高度作為缺陷的尺寸即可。繼而,尺寸檢測部103向檢測結果記憶裝置4發送表示所檢測的寬度及高度的尺寸資訊並記憶。Furthermore, as shown in FIG. 2 and the like, among the end faces of the glass plate captured in the captured image, the pixel values of the portion where the defect is captured are different from those of the portion without the defect. Therefore, as long as the region including the pixel value specific to the portion where the defect is imaged is included in the region captured as described above and the end surface of the glass plate is extracted, the size detection unit 103 only needs to detect the width and height of the region as The size of the defect is sufficient. Next, the size detection unit 103 sends and stores size information indicating the detected width and height to the detection result storage device 4 .

(檢查步驟的流程) 圖9為表示本實施形態的檢查步驟的一例的流程圖。再者,對於該流程圖中的、與圖4的流程圖相同的處理,標註與圖4相同的編號,不重覆進行其說明。 (Flow of checking steps) FIG. 9 is a flow chart showing an example of the inspection procedure in this embodiment. In this flowchart, the same processes as those in the flowchart of FIG. 4 are assigned the same numbers as those in FIG. 4 , and the description thereof will not be repeated.

S31中,尺寸檢測部103判定S4中檢測的缺陷的尺寸是否為正常範圍內。於判定為正常範圍內的情形時(S31中為是(YES)),檢查步驟進入S5。於判定為並非正常範圍內、即正常範圍外的情形時(S31中為否(NO)),檢查步驟進入S32。In S31, the dimension detection part 103 judges whether the dimension of the defect detected in S4 is within a normal range. When it is determined that it is within the normal range (YES in S31 ), the checking step proceeds to S5 . When it is determined that it is not within the normal range, that is, outside the normal range (NO in S31 ), the checking step proceeds to S32 .

S32中,尺寸檢測部103將基於尺寸檢測模型112所輸出的推論結果的、尺寸的檢測結果廢棄,S33中,尺寸檢測部103對構成拍攝圖像的各畫素的畫素值進行數值分析,再次檢測缺陷的尺寸。然後,檢查步驟進入S5。In S32, the size detection unit 103 discards the size detection result based on the inference result output by the size detection model 112, and in S33, the size detection unit 103 numerically analyzes the pixel values of the pixels constituting the captured image, The size of the defect is checked again. Then, the checking step goes to S5.

自S33進入的S5中,尺寸檢測部103亦可使表示執行了再次檢測的資訊與尺寸資訊關聯地記憶於檢測結果記憶裝置4。藉此,檢查系統100的用戶可確定進行了再次檢測的拍攝圖像。In S5 entered from S33 , the size detection unit 103 may store information indicating that the re-detection has been performed in association with the size information in the detection result memory device 4 . Thereby, the user of the inspection system 100 can identify the captured image for which re-inspection was performed.

而且,S32亦可省略。於該情形時,S5中,尺寸檢測部103使表示S4的檢測結果的尺寸資訊、及表示S33的檢測結果的尺寸資訊兩者記憶於檢測結果記憶裝置4。Moreover, S32 can also be omitted. In this case, in S5 , the size detecting unit 103 stores both the size information indicating the detection result in S4 and the size information indicating the detection result in S33 in the detection result storage device 4 .

(作用、效果) 如以上般,本實施形態的檢查裝置1中,尺寸檢測部103於所檢測的缺陷的尺寸為正常範圍外的情形時,對構成拍攝圖像的各畫素的畫素值進行數值分析,再次檢測該缺陷的尺寸。 (Effect) As described above, in the inspection device 1 of the present embodiment, when the size of the detected defect is out of the normal range, the size detection unit 103 performs numerical analysis on the pixel values of each pixel constituting the captured image, and again The size of the defect is detected.

根據所述結構,針對尺寸為正常範圍外的缺陷,對構成拍攝圖像的各畫素的畫素值進行數值分析而進行尺寸的再次檢測。即,利用與使用學習完畢模型1的缺陷的尺寸檢測不同的方法進行尺寸的再次檢測,故而可修正為適當的尺寸。According to the above configuration, for a defect whose size is out of the normal range, the pixel value of each pixel constituting the captured image is numerically analyzed to re-inspect the size. That is, since the re-inspection of the size is performed by a method different from the size detection of the defect using the learned model 1, it can be corrected to an appropriate size.

〔變形例〕 所述各實施形態中,對檢測於玻璃板的端面產生的缺陷的尺寸的示例進行了說明,但亦可檢測於玻璃板的端面以外的部分產生的缺陷的尺寸。而且,所述各實施形態中,對檢測自玻璃原板切出的玻璃板所產生的缺陷的尺寸的示例進行了說明,但成為對象的玻璃板不限於自玻璃原板切出。例如,亦可檢測包含玻璃板的製品中的玻璃板部分所產生的缺陷的尺寸等。 〔Modification〕 In each of the above-described embodiments, an example in which the size of the defect generated on the end surface of the glass plate was detected was described, but the size of the defect generated on a portion other than the end surface of the glass plate may also be detected. Furthermore, in each of the above-described embodiments, an example of detecting the size of a defect generated in a glass sheet cut out from a glass original sheet has been described, but the target glass sheet is not limited to cutting out from a glass original sheet. For example, it is also possible to detect the size and the like of a defect generated in a glass plate portion of a product including a glass plate.

而且,所述各實施形態中,表示了藉由一台檢查裝置進行有無缺陷(及種類)的判定與尺寸的檢測兩者的示例,但該些處理亦可分別由不同裝置進行。即,所述各實施形態中說明的檢查方法可由一台檢查裝置執行,亦可由多台檢查裝置執行。Furthermore, in each of the above-described embodiments, an example was shown in which both determination of the presence or absence of defects (and type) and detection of dimensions were performed by one inspection device, but these processes may be performed by separate devices. That is, the inspection method described in each of the above-mentioned embodiments may be executed by one inspection device, or may be executed by a plurality of inspection devices.

而且,所述各實施形態中,對將缺陷判定模型111及尺寸檢測模型112分別設為不同模型的示例進行了說明,但亦可使用學習了有無缺陷與缺陷的位置及範圍的一個模型。於該情形時,若向該一個模型輸入拍攝圖像,則輸出表示有無缺陷的推論結果。而且,於有缺陷的情形時,亦一併輸出表示其位置及範圍的推論結果。而且,亦可使該一個模型針對缺陷的種類進行推論。Furthermore, in each of the above-described embodiments, an example in which the defect determination model 111 and the dimension detection model 112 are respectively different models has been described, but one model that learns the presence or absence of defects and the positions and ranges of defects may be used. In this case, when a captured image is input to the one model, an inference result indicating the presence or absence of a defect is output. Furthermore, when there is a defect, an inference result showing its position and range is also output together. Furthermore, it is also possible to infer this one model with respect to the type of defect.

〔藉由軟體的實現例〕 檢查裝置1(以下稱為「裝置」)的功能可藉由下述程式(檢查程式)實現,該程式用於使電腦作為所述裝置發揮功能,並且用於使電腦作為所述裝置的各控制塊(尤其是控制部10所含的各部)發揮功能。 〔Example of realization by software〕 The function of the inspection device 1 (hereinafter referred to as "device") can be realized by the following program (inspection program) for making a computer function as the device and for controlling each of the devices as the computer. The blocks (in particular, each unit included in the control unit 10 ) function.

於該情形時,所述裝置包括電腦,所述電腦具有至少一個控制裝置(例如處理器)及至少一個記憶裝置(例如記憶體)作為用以執行所述程式的硬體。藉由利用該控制裝置及記憶裝置執行所述程式,從而實現所述各實施形態中說明的各功能。In this case, the device includes a computer having at least one control device (such as a processor) and at least one storage device (such as a memory) as hardware for executing the program. Each function described in each of the above-described embodiments is realized by executing the program using the control device and the storage device.

所述程式亦可記錄於非暫時性且電腦可讀取的一個或多個記錄媒體。該記錄媒體可由所述裝置包括,亦可不包括。後者的情形時,所述程式亦可經由有線或無線的任意的傳輸媒體供給於所述裝置。The program can also be recorded in one or more non-transitory and computer-readable recording media. The recording medium may or may not be included by the device. In the latter case, the program may be supplied to the device via any wired or wireless transmission medium.

而且,所述各控制塊的功能的一部分或全部亦可藉由邏輯迴路而實現。例如,形成有作為所述各控制塊發揮功能的邏輯迴路的積體電路亦包含於本發明的範疇。除此以外,例如亦可藉由量子電腦而實現所述各控制塊的功能。 而且,包括以下結構的電腦程式產品亦包含於本發明的範疇。即,本發明的一態樣的電腦程式產品經由電腦加載(load)檢查程式,且執行下述命令:使處理器獲取拍攝玻璃板所得的拍攝圖像;以及使所述處理器檢測向學習完畢模型輸入所述拍攝圖像所得的推論結果中的、範圍的尺寸,作為所拍攝的所述玻璃板所產生的缺陷的尺寸,所述學習完畢模型以推論玻璃板所產生的缺陷的位置及所述範圍的方式,對該位置及範圍進行了學習。 Moreover, part or all of the functions of the control blocks may be realized by logic circuits. For example, an integrated circuit in which a logic circuit functioning as each of the above-mentioned control blocks is formed is also included in the scope of the present invention. In addition, for example, the functions of the control blocks can also be realized by a quantum computer. Furthermore, computer program products including the following configurations are also included in the scope of the present invention. That is, the computer program product of one aspect of the present invention loads (loads) the inspection program via the computer, and executes the following commands: causing the processor to acquire a captured image obtained by capturing a glass plate; The model inputs the size of the range in the inference result obtained from the photographed image as the size of the defect generated on the glass plate captured, and the learned model is used to deduce the position of the defect generated on the glass plate and the size of the defect generated on the glass plate. The position and the range are studied in the manner of the above-mentioned range.

本發明不限定於所述各實施形態,可於申請專利範圍所示的範圍進行各種變更,將不同實施形態分別揭示的技術手段適當組合所得的實施形態亦包含於本發明的技術範圍。The present invention is not limited to the above-mentioned embodiments, and various changes can be made within the range indicated in the patent claims. Embodiments obtained by appropriately combining the technical means disclosed in different embodiments are also included in the technical scope of the present invention.

1:檢查裝置 2:攝像裝置 3:圖像記憶裝置 4:檢測結果記憶裝置 10:控制部 11:記憶部 12:通訊部 21、32、33:拍攝圖像 31:圖像 41~48:矩形 52~54:數值 61:包含區域 100:檢查系統 101:圖像獲取部 102:缺陷判定部 103:尺寸檢測部 111:缺陷判定模型 112:尺寸檢測模型 S1~S5、S11、S12、S21~S23、S31~S33、S101、S102:步驟 1: Check the device 2: camera device 3: Image memory device 4: Test result memory device 10: Control Department 11: Memory Department 12: Department of Communications 21, 32, 33: Capture images 31: Image 41~48: rectangle 52~54: value 61: Include area 100: Check system 101: Image Acquisition Department 102:Defect Judgment Department 103: Size inspection department 111: Defect Judgment Model 112: Dimensional detection model S1~S5, S11, S12, S21~S23, S31~S33, S101, S102: steps

圖1為表示本發明的實施形態1的檢查系統的概要、及檢查系統所含的檢查裝置的要部結構的一例的區塊圖。 圖2為表示利用尺寸檢測模型的、缺陷的位置及範圍的推論例的圖。 圖3為表示伴有由所述檢查裝置進行的檢查的、玻璃板的製造步驟的一例的流程圖。 圖4為表示所述製造步驟所含的檢查步驟的一例的流程圖。 圖5為表示基於可靠度的缺陷的尺寸檢測例的圖。 圖6為表示本發明的實施形態2的檢查步驟的一例的流程圖。 圖7為表示本發明的實施形態3的尺寸檢測部執行的缺陷的尺寸檢測的概要的圖。 圖8為表示本發明的實施形態3的檢查步驟的一例的流程圖。 圖9為表示本發明的實施形態4的檢查步驟的一例的流程圖。 FIG. 1 is a block diagram showing an overview of an inspection system according to Embodiment 1 of the present invention and an example of a configuration of main parts of an inspection device included in the inspection system. FIG. 2 is a diagram showing an example of inference of the position and range of a defect using a dimension inspection model. Fig. 3 is a flow chart showing an example of a manufacturing procedure of a glass plate accompanied by inspection by the inspection device. FIG. 4 is a flowchart showing an example of an inspection step included in the manufacturing step. FIG. 5 is a diagram showing an example of dimension detection of defects based on reliability. Fig. 6 is a flow chart showing an example of an inspection procedure according to Embodiment 2 of the present invention. Fig. 7 is a diagram showing an overview of size detection of defects performed by a size detection unit according to Embodiment 3 of the present invention. Fig. 8 is a flow chart showing an example of an inspection procedure according to Embodiment 3 of the present invention. Fig. 9 is a flow chart showing an example of an inspection procedure according to Embodiment 4 of the present invention.

1:檢查裝置 1: Check the device

2:攝像裝置 2: camera device

3:圖像記憶裝置 3: Image memory device

4:檢測結果記憶裝置 4: Test result memory device

10:控制部 10: Control Department

11:記憶部 11: Memory Department

12:通訊部 12: Department of Communications

100:檢查系統 100: Check system

101:圖像獲取部 101: Image Acquisition Department

102:缺陷判定部 102:Defect Judgment Department

103:尺寸檢測部 103: Size inspection department

111:缺陷判定模型 111: Defect Judgment Model

112:尺寸檢測模型 112: Dimensional detection model

Claims (10)

一種檢查裝置,包括: 圖像獲取部,獲取拍攝玻璃板所得的拍攝圖像;以及 尺寸檢測部,檢測向學習完畢模型輸入所述拍攝圖像所得的推論結果中的範圍的尺寸,作為所拍攝的所述玻璃板所產生的缺陷的尺寸,所述學習完畢模型以推論玻璃板所產生的缺陷的位置及所述範圍的方式,對所述位置及範圍進行了學習。 An inspection device comprising: an image acquisition unit that acquires a photographed image obtained by photographing the glass plate; and A size detecting unit detects a size of a range in an inference result obtained by inputting the captured image to a learned model that infers the size of a defect generated in the glass plate as a size of the captured defect in the glass plate. The positions and ranges of the generated defects are learned, and the positions and ranges are learned. 如請求項1所述的檢查裝置,其中所述學習完畢模型進而輸出針對所述推論結果的可靠度, 所述尺寸檢測部檢測所述可靠度為既定臨限值以上的所述推論結果中的所述範圍的尺寸,作為所拍攝的所述玻璃板所產生的缺陷的尺寸。 The inspection device according to claim 1, wherein the learned model further outputs the reliability of the inference result, The size detection unit detects the size of the range in the inference result in which the reliability is equal to or greater than a predetermined threshold value, as the size of the imaged defect generated in the glass plate. 如請求項1或請求項2所述的檢查裝置,其中所述尺寸檢測部於獲得多個所述推論結果的情形時,檢測包含多個所述推論結果中的多個範圍的區域的尺寸,作為所拍攝的所述玻璃板所產生的缺陷的尺寸。The inspection device according to claim 1 or claim 2, wherein the size detecting unit detects the size of a region including a plurality of ranges among the plurality of inference results when a plurality of the inference results are obtained, As the size of the defect produced by the glass plate as photographed. 如請求項1或請求項2所述的檢查裝置,其中所述尺寸檢測部於所檢測的缺陷的尺寸為正常範圍外的情形時,對構成所述拍攝圖像的各畫素的畫素值進行數值分析,再次檢測所述缺陷的尺寸。The inspection device according to claim 1 or claim 2, wherein when the size of the detected defect is out of the normal range, the size detection unit checks the pixel value of each pixel constituting the captured image Numerical analysis was carried out to check again the size of the defect. 如請求項1或請求項2所述的檢查裝置,其中所述圖像獲取部獲取拍攝所述玻璃板的端面所得的所述拍攝圖像。The inspection device according to claim 1 or claim 2, wherein the image acquisition unit acquires the photographed image obtained by photographing the end surface of the glass plate. 如請求項1所述的檢查裝置,其中所述尺寸檢測部檢測所述推論結果所示的範圍的內部與外部的邊界的畫素值的變化量為既定臨限值以上的所述推論結果中的所述範圍的尺寸,作為所拍攝的所述玻璃板所產生的缺陷的尺寸。The inspection device according to claim 1, wherein the size detection unit detects that in the inference result, the change amount of the pixel value at the boundary between the inside and the outside of the range indicated by the inference result is equal to or greater than a predetermined threshold value The size of the range is taken as the size of the defect generated on the glass plate. 一種檢查方法,由檢查裝置所執行,且包括: 圖像獲取步驟,獲取拍攝玻璃板所得的拍攝圖像;以及 尺寸檢測步驟,檢測向學習完畢模型輸入所述拍攝圖像所得的推論結果中的範圍的尺寸,作為所拍攝的所述玻璃板所產生的缺陷的尺寸,所述學習完畢模型以推論玻璃板所產生的缺陷的位置及所述範圍的方式,對所述位置及範圍進行了學習。 An inspection method, performed by an inspection device, comprising: An image acquisition step of acquiring a photographed image obtained by photographing the glass plate; and A size detection step of detecting the size of a range in the inference result obtained by inputting the photographed image to the learned model, as the size of the defect generated in the captured glass plate, the learned model deduces the size of the glass plate The positions and ranges of the generated defects are learned, and the positions and ranges are learned. 一種玻璃板的製造方法,包括將玻璃原板成型為既定尺寸的玻璃板的步驟、及由檢查裝置執行的所述玻璃板的檢查步驟,且 所述檢查步驟包含: 圖像獲取步驟,獲取拍攝所述玻璃板所得的拍攝圖像;以及 尺寸檢測步驟,檢測向學習完畢模型輸入所述拍攝圖像所得的推論結果中的範圍的尺寸,作為所拍攝的所述玻璃板所產生的缺陷的尺寸,所述學習完畢模型以推論所述玻璃板所產生的缺陷的位置及所述範圍的方式,對所述位置及範圍進行了學習。 A method of manufacturing a glass plate, comprising the steps of forming a glass raw plate into a glass plate of a predetermined size, and inspecting the glass plate by an inspection device, and The inspection steps include: an image acquiring step of acquiring a photographed image obtained by photographing the glass plate; and A size detection step of detecting, as the size of a defect generated in the captured glass plate, the size of a range in the inference result obtained by inputting the captured image to the learned model that deduces the size of the glass plate. The positions and ranges of the defects generated on the board were studied, and the positions and ranges were learned. 一種檢查程式,用於使電腦作為如請求項1所述的檢查裝置發揮功能,並且用於使電腦作為所述圖像獲取部及所述尺寸檢測部發揮功能。An inspection program for causing a computer to function as the inspection device according to Claim 1, and for causing the computer to function as the image acquisition unit and the size detection unit. 一種電腦程式產品,經由電腦加載檢查程式,且執行下述命令: 使處理器獲取拍攝玻璃板所得的拍攝圖像;以及 使所述處理器檢測向學習完畢模型輸入所述拍攝圖像所得的推論結果中的範圍的尺寸,作為所拍攝的所述玻璃板所產生的缺陷的尺寸,所述學習完畢模型以推論玻璃板所產生的缺陷的位置及所述範圍的方式,對所述位置及範圍進行了學習。 A computer program product that loads an inspection program via a computer and executes the following commands: causing the processor to acquire a captured image of the glass plate; and causing the processor to detect, as a size of a defect generated in the captured glass plate, a size of a range in an inference result obtained by inputting the captured image to a learned model that infers the size of the glass plate The positions and ranges of the generated defects are learned, and the positions and ranges are learned.
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