TW202210838A - Contact terminal, inspection jig, inspection device, and manufacturing method - Google Patents

Contact terminal, inspection jig, inspection device, and manufacturing method Download PDF

Info

Publication number
TW202210838A
TW202210838A TW110131991A TW110131991A TW202210838A TW 202210838 A TW202210838 A TW 202210838A TW 110131991 A TW110131991 A TW 110131991A TW 110131991 A TW110131991 A TW 110131991A TW 202210838 A TW202210838 A TW 202210838A
Authority
TW
Taiwan
Prior art keywords
shape
contact terminal
conductor
cylindrical body
slit
Prior art date
Application number
TW110131991A
Other languages
Chinese (zh)
Inventor
太田憲宏
Original Assignee
日商日本電產理德股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日商日本電產理德股份有限公司 filed Critical 日商日本電產理德股份有限公司
Publication of TW202210838A publication Critical patent/TW202210838A/en

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06711Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733Geometry aspects
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06711Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716Elastic
    • G01R1/06722Spring-loaded
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/073Multiple probes
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851Testing of integrated circuits [IC]
    • G01R31/2855Environmental, reliability or burn-in testing
    • G01R31/286External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2863Contacting devices, e.g. sockets, burn-in boards or mounting fixtures
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851Testing of integrated circuits [IC]
    • G01R31/2896Testing of IC packages; Test features related to IC packages
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00Arrangements or instruments for measuring magnetic variables
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Abstract

To provide a contact terminal, an inspection jig, an inspection device, and a manufacturing method for easily reducing the likelihood of a conductor falling out of a tubular body. A contact terminal Pr comprises a tubular body Pa and a substantially rod-shaped first conductor P1. A first slit SL1 is formed extending from one end of the tubular body Pa toward the other end side of the tubular body Pa. A narrow portion N1 in which the width of the first slit SL1 is reduced is provided in a position spaced apart by a first distance D1 from the end on the other end side toward the one end side of the first slit SL1. A rod-shaped body Pb1 of the first conductor P1 includes an engaging portion K1 positioned in a receiving portion A1 of the first slit SL1 which is a region between the end on the other end side and the narrow portion N1. The engaging portion K1 protrudes in a Y-direction to a position allowing for interference with the narrow portion N1, the Y-direction being perpendicular to an X-direction, which is the width direction of the first slit SL1, and an axial direction Z of the tubular body.

Description

接觸端子、檢查治具、檢查裝置、及製造方法Contact terminal, inspection jig, inspection device, and manufacturing method

本發明係關於使用於檢查對象的檢查的接觸端子、用以使該接觸端子接觸檢查對象的檢查治具、具備該檢查治具的檢查裝置、及製造方法。The present invention relates to a contact terminal used for inspection of an inspection object, an inspection jig for bringing the contact terminal into contact with the inspection object, an inspection apparatus including the inspection jig, and a manufacturing method.

先前,公知具備接觸測定對象物的導電墊之棒狀的導體,與插入該棒狀的導體之圓筒狀的筒體,筒體的周壁部的一部分成為彈簧的線圈彈簧探針(例如參照專利文獻1)。 [先前技術文獻] [專利文獻]Conventionally, there has been known a coil spring probe in which a rod-shaped conductor provided with a conductive pad that contacts the object to be measured, and a cylindrical cylindrical body into which the rod-shaped conductor is inserted, and a part of the peripheral wall of the cylindrical body serves as a spring (for example, refer to patent Reference 1). [Prior Art Literature] [Patent Literature]

[專利文獻1]日本特開2007-24664號公報[Patent Document 1] Japanese Patent Laid-Open No. 2007-24664

[發明所欲解決之課題][The problem to be solved by the invention]

然而,近年來,測定對象物的半導體基板及電路基板的細微化有所進展。測定對象物的檢查點、檢查點間的鄰接間距變小。因此,檢查所使用之探針(接觸端子)的直徑成為0.1mm程度。因此,上述的線圈彈簧探針將直徑設為0.1mm時,於直徑0.1mm的筒體中,還進而插入細棒狀的導體。However, in recent years, the miniaturization of semiconductor substrates and circuit substrates of measurement objects has progressed. The inspection points of the object to be measured and the adjacent distance between the inspection points are reduced. Therefore, the diameter of the probe (contact terminal) used for the inspection is about 0.1 mm. Therefore, when the diameter of the above-mentioned coil spring probe is set to 0.1 mm, a thin rod-shaped conductor is further inserted into a cylindrical body having a diameter of 0.1 mm.

於筒體中僅插入棒狀的導體的話,會有棒狀的導體從筒體脫落之虞。但是,於如上述般之細微構造的接觸端子,設置防止棒狀的導體脫落的機構並不容易。If only the rod-shaped conductor is inserted into the cylinder, the rod-shaped conductor may come off from the cylinder. However, it is not easy to provide a mechanism for preventing the rod-shaped conductor from falling off in a contact terminal having a fine structure as described above.

本發明的目的係提供容易減低導體從筒狀體脫落之虞的接觸端子、檢查治具、檢查裝置、及製造方法。 [用以解決課題之手段]It is an object of the present invention to provide a contact terminal, an inspection jig, an inspection apparatus, and a manufacturing method that can easily reduce the risk of the conductor falling off from the cylindrical body. [means to solve the problem]

本發明之一例的接觸端子,係具備:筒狀體,係具有導電性;及第一導體,係具有具有大略棒狀形狀,且位於前述筒狀體之一端側的筒內的棒狀本體,及從前述筒狀體的前述一端突出的外部導體部;形成從前述筒狀體的一端朝向前述筒狀體的另一端側延伸的第一縫隙;於從前述第一縫隙的前述另一端側的端部往前述一端側隔開預先設定的第一距離的位置,設置前述第一縫隙的寬度縮小的縮小部;前述棒狀本體,係包含位於前述第一縫隙之在前述另一端側的端部與前述縮小部之間的區域即承接部內,突出到朝向前述第一縫隙的寬度方向即第一方向及垂直於前述筒狀體的軸方向的第二方向可與前述縮小部相互卡住的位置為止的卡合部。A contact terminal according to an example of the present invention includes: a cylindrical body having conductivity; and a first conductor having a substantially rod-like shape and a rod-shaped body located in the cylinder on one end side of the cylindrical body, and an outer conductor portion protruding from the one end of the cylindrical body; forming a first slit extending from one end of the cylindrical body toward the other end side of the cylindrical body; on the other end side of the first slit The end portion is separated from the one end side by a preset first distance, and a narrowing portion of which the width of the first slit is reduced is provided; the rod-shaped body includes an end portion located on the other end side of the first slit. In the receiving portion, the region between the narrowing portion and the width direction of the first slit, that is, the first direction and the second direction perpendicular to the axial direction of the cylindrical body, the narrowing portion and the narrowing portion can be mutually caught. up to the engaging part.

又,本發明之一例的檢查治具,係具備:上述的接觸端子,與支持前述接觸端子的支持構件。Further, an inspection jig according to an example of the present invention includes the above-mentioned contact terminal, and a support member for supporting the above-mentioned contact terminal.

又,本發明之一例的檢查裝置,係具備:上述的檢查治具,與依據藉由使前述接觸端子接觸設置於檢查對象的檢查點所得之電性訊號,進行前述檢查對象的檢查的檢查處理部。Further, an inspection apparatus according to an example of the present invention includes the inspection jig described above, and an inspection process for performing the inspection of the inspection object based on an electrical signal obtained by bringing the contact terminal into contact with an inspection point provided in the inspection object. department.

又,本發明之一例的筒狀體的製造方法,係上述的接觸端子之筒狀體的製造方法,其中:(a1)於導電性的筒狀的構件之外壁面形成光阻;(a2)於從前述外壁面的前述一端隔開的位置中於前述光阻曝光第一形狀;前述第一形狀,係包含對向於前述第一方向之一對的邊一邊隨著朝向前述一端側逐漸接近,一邊匯合的第一部分的形狀;(a3)去除前述光阻之前述曝光的部分;(a4)對前述光阻之前述被除去的部分中露出的前述外壁面進行蝕刻,並且到從前述第一部分擴大且被除去的部分到達前述筒狀的構件的前述一端以形成前述縮小部為止持續前述蝕刻。In addition, a method of manufacturing a cylindrical body according to an example of the present invention is the method of manufacturing a cylindrical body of the above-mentioned contact terminal, wherein: (a1) a photoresist is formed on the outer wall surface of the conductive cylindrical member; (a2) A first shape is exposed to the photoresist at a position separated from the one end of the outer wall surface; the first shape includes a pair of sides facing the first direction gradually approaching toward the one end side , the shape of the first part that converges on one side; (a3) remove the previously exposed part of the photoresist; (a4) etch the outer wall surface exposed in the removed part of the photoresist, and from the first part The etching is continued until the enlarged and removed portion reaches the one end of the cylindrical member to form the narrowed portion.

又,本發明之一例的筒狀體的製造方法,係上述的接觸端子之筒狀體的製造方法,其中:(b1)於導電性的筒狀的構件之外壁面形成光阻;(b2)將第一形狀,與從前述第一形狀隔開的第二形狀曝光於前述光阻;前述第一形狀,係包含對向於前述第一方向之一對的邊一邊隨著朝向前述一端側逐漸接近,一邊匯合的第一部分的形狀;前述第二形狀,係包含從前述外壁面的前述一端往前述另一端方向延伸的第二部分,與連接於前述第二部分並且對向於前述第一方向之一對的邊一邊隨著朝向前述另一端側逐漸接近,一邊匯合的第三部分的形狀;(b3)去除前述光阻之前述曝光的部分;(b4)對前述光阻之前述被除去的部分中露出的前述外壁面進行蝕刻,並且從前述第一部分擴大且被除去的部分與從前述第三部分擴大去除的部分連通以形成前述縮小部及前述漏斗狀部為止持續前述蝕刻。In addition, a method for producing a cylindrical body according to an example of the present invention is the above-mentioned method for producing a cylindrical body of a contact terminal, wherein: (b1) a photoresist is formed on the outer wall surface of the conductive cylindrical member; (b2) A first shape and a second shape spaced from the first shape are exposed to the photoresist; the first shape includes a pair of sides facing the first direction as it goes toward the one end side gradually The shape of the first part that is close to and converges on one side; the second shape includes a second part extending from the one end of the outer wall surface to the direction of the other end, and a second part connected to the second part and facing the first direction. The shape of the third portion where one pair of sides is gradually approached toward the other end side and converges; (b3) the exposed portion of the photoresist is removed; (b4) the removed portion of the photoresist The part of the exposed outer wall surface is etched, and the part enlarged and removed from the first part communicates with the part enlarged and removed from the third part to form the narrowed part and the funnel-shaped part.

又,本發明之一例的第一導體的製造方法,係上述的接觸端子之第一導體的製造方法,其中:(c1)形成前述一對狹窄板部中一方;(c2)於前述一方之狹窄板部上層積前述中心板部;(c3)於前述中心板部上層積前述一對的狹窄板部中另一方。 [發明的效果]In addition, a method of manufacturing a first conductor according to an example of the present invention is the method of manufacturing a first conductor of the above-mentioned contact terminal, wherein: (c1) one of the pair of narrow plate portions is formed; (c2) the narrow portion of the one is formed. The center plate portion is stacked on the plate portion; (c3) the other of the pair of narrow plate portions is stacked on the center plate portion. [Effect of invention]

此種構造的接觸端子、檢查治具、及檢查裝置係容易減低導體從筒狀體脫落之虞。又,依據此種製造方法,可容易製造容易減低導體從筒狀體脫落之虞的接觸端子。The contact terminal, the inspection jig, and the inspection device of such a structure can easily reduce the risk of the conductor falling off from the cylindrical body. Moreover, according to such a manufacturing method, it becomes easy to manufacture the contact terminal which easily reduces the possibility that a conductor may fall off from a cylindrical body.

以下,依據圖式來說明本發明的實施形態。再者,於各圖中附加相同符號的構造係表示相同的構造,省略其說明。於各圖為了讓方向關係明確,適當揭示XYZ的正交座標軸。+X、-X(X方向)相當於第一方向,+Y、-Y (Y方向)相當於第二方向,+Z相當於一端方向,-Z相當於另一端方向。又,於各圖中,有以括弧表示第二縫隙SL2及第二導體P2相關部分的符號之狀況。Hereinafter, embodiments of the present invention will be described with reference to the drawings. In addition, the structure which attached|subjected the same code|symbol to each figure shows the same structure, and abbreviate|omits the description. In each drawing, in order to clarify the directional relationship, the orthogonal coordinate axes of XYZ are appropriately disclosed. +X and -X (X direction) correspond to the first direction, +Y and -Y (Y direction) correspond to the second direction, +Z corresponds to one end direction, and -Z corresponds to the other end direction. In addition, in each drawing, there are cases in which the symbols of the parts related to the second slot SL2 and the second conductor P2 are shown in parentheses.

圖1所示的檢查裝置1係例如用以檢查半導體晶圓等之形成於檢查對象物101的電路的半導體檢查裝置。The inspection apparatus 1 shown in FIG. 1 is a semiconductor inspection apparatus for inspecting the circuit formed in the inspection object 101, such as a semiconductor wafer, for example.

於檢查對象物101,例如於矽等的半導體基板,形成對應複數半導體晶片的電路。再者,檢查對象物係作為半導體晶片、CSP(Chip Size Package)、半導體元件(IC:Integrated Circuit)等的電子零件亦可,此外只要是進行電性檢查的對象者即可。Circuits corresponding to a plurality of semiconductor wafers are formed on the inspection object 101, for example, on a semiconductor substrate such as silicon. In addition, the inspection object may be an electronic component such as a semiconductor wafer, a CSP (Chip Size Package), or a semiconductor element (IC: Integrated Circuit), and it is only necessary to be an object of electrical inspection.

又,檢查裝置並不限於半導體檢查裝置,例如作為檢查基板的基板檢查裝置亦可。成為檢查對象物的基板係例如作為印刷配線基板、玻璃環氧基板、可撓性基板、陶瓷多層配線基板、半導體封裝用的封裝基板、互連體基板、薄膜載具等的基板亦可,作為液晶顯示器、EL (Electro-Luminescence)顯示器、觸控面板顯示器等之顯示器用的電極板、觸控面板用等的電極板亦可,作為各種基板亦可。In addition, the inspection apparatus is not limited to a semiconductor inspection apparatus, and may be, for example, a substrate inspection apparatus for inspecting a substrate. The substrates to be inspected may be, for example, printed wiring substrates, glass epoxy substrates, flexible substrates, ceramic multilayer wiring substrates, packaging substrates for semiconductor packaging, interconnector substrates, film carriers, and the like. Electrode plates for displays such as liquid crystal displays, EL (Electro-Luminescence) displays, touch panel displays, and electrode plates for touch panels may be used, and may be used as various substrates.

圖1所示的檢查裝置1係具備檢查部4、試料台6、檢查處理部8。於試料台6的上面,設置載置檢查對象物101的載置部6a,試料台6係以將檢查對象的檢查對象物101固定於所定位置之方式構成。The inspection apparatus 1 shown in FIG. 1 includes an inspection unit 4 , a sample stage 6 , and an inspection processing unit 8 . On the upper surface of the sample table 6, a placing portion 6a on which the inspection object 101 is placed is provided, and the sample table 6 is configured to fix the inspection object 101 to be inspected at a predetermined position.

載置部6a係例如可升降,可使收容於試料台6內的檢查對象物101上升至檢查位置,或將已檢查的檢查對象物101收納於試料台6內。又,載置部6a係例如可讓檢查對象物101旋轉,以使定向平面(Orientation flat)朝向所定方向。又,檢查裝置1係具備省略圖示之機器臂等的搬送機構,藉由該搬送機構,將檢查對象物101載置於載置部6a,或將已檢查的檢查對象物101從載置部6a搬出。The placing portion 6 a is movable up and down, for example, so that the inspection object 101 accommodated in the sample table 6 can be raised to the inspection position, or the inspected object 101 that has been inspected can be accommodated in the sample table 6 . Moreover, the mounting part 6a can rotate the inspection object 101 so that an orientation flat may face a predetermined direction, for example. In addition, the inspection apparatus 1 is provided with a conveyance mechanism such as a robot arm (not shown), and the inspection object 101 is placed on the placement portion 6a by the conveyance mechanism, or the inspected inspection object 101 is removed from the placement portion. 6a moved out.

檢查部4係具備檢查治具3、連接板35及測試頭37。檢查治具3係使複數接觸端子Pr接觸檢查對象物101用以進行檢查的治具,例如構成為所謂探針卡。The inspection unit 4 includes an inspection jig 3 , a connection plate 35 , and a test head 37 . The inspection jig 3 is a jig for inspecting a plurality of contact terminals Pr in contact with the inspection object 101 , and is configured as a so-called probe card, for example.

於檢查對象物101,形成複數晶片。於各晶片形成複數墊片或凸塊等的檢查點。檢查治具3係對應形成於檢查對象物101的複數晶片中一部分的區域(例如圖1以影線表示的區域,以下稱為檢查區域),以對應檢查區域內的各檢查點之方式,保持複數接觸端子Pr。A plurality of wafers are formed on the inspection object 101 . A plurality of inspection points such as pads and bumps are formed on each wafer. The inspection jig 3 corresponds to an area (for example, the area indicated by hatching in FIG. 1 , hereinafter referred to as an inspection area) formed on a part of the plurality of wafers of the inspection object 101 , and holds it so as to correspond to each inspection point in the inspection area. Plural contact terminals Pr.

使接觸端子Pr接觸檢查區域內的各檢查點,結束該檢查區域內的檢查的話,載置部6a使檢查對象物101下降,試料台6平行移動以移動檢查區域,載置部6a使檢查對象物101上升,使接觸端子Pr接觸新的檢查區域來進行檢查。如此,藉由一邊依序移動檢查區域一邊進行檢查,來執行檢查對象物101整體的檢查。When the contact terminal Pr is brought into contact with each inspection point in the inspection area, and the inspection in the inspection area is completed, the placing portion 6a lowers the inspection object 101, the sample stage 6 is moved in parallel to move the inspection area, and the placing portion 6a moves the inspection object. The object 101 is lifted, and the contact terminal Pr is brought into contact with the new inspection area to perform inspection. In this way, the inspection of the entire inspection object 101 is performed by performing inspection while sequentially moving the inspection area.

再者,圖1係根據容易理解發明的觀點,簡略地及概念性揭示檢查裝置1的構造之一例的說明圖,關於接觸端子Pr的數量、密度、配置、檢查部4及試料台6的各部形狀、大小的比率等,也簡略化、概念化記載。例如,在容易理解接觸端子Pr的配置的觀點中,相較於一般的半導體檢查裝置,放大強調記載檢查區域,檢查區域更小亦可,更大亦可。1 is an explanatory diagram briefly and conceptually showing an example of the structure of the inspection apparatus 1 from the viewpoint of easy understanding of the invention, regarding the number, density, arrangement of the contact terminals Pr, and each part of the inspection part 4 and the sample stage 6 . The ratio of shapes and sizes, etc., are also simplified and conceptualized. For example, from the viewpoint of easy understanding of the arrangement of the contact terminals Pr, the inspection area may be enlarged and emphasized compared to a general semiconductor inspection apparatus, and the inspection area may be smaller or larger.

測試頭37係構成為可裝卸連接板35。於連接板35,設置和各接觸端子Pr的端部接觸導通之後述的電極34a。測試頭37係藉由省略圖示的纜線及連接端子等,電性連接各電極34a與檢查處理部8。連接板35係在各接觸端子Pr與測試頭37之間進行間距轉換亦可。The test head 37 is configured as a detachable connection plate 35 . The connection plate 35 is provided with an electrode 34a which will be described later in contact with the end portion of each contact terminal Pr. The test head 37 is electrically connected to each electrode 34a and the inspection processing unit 8 by cables, connection terminals, etc., which are not shown in the drawings. The connection plate 35 may perform pitch conversion between each contact terminal Pr and the test head 37 .

檢查治具3係具備複數接觸端子Pr,與保持複數接觸端子Pr的支持構件31。The inspection jig 3 includes a plurality of contact terminals Pr, and a support member 31 that holds the plurality of contact terminals Pr.

檢查部4係具備透過測試頭37及連接板35,將檢查治具3的各接觸端子Pr與檢查處理部8電性連接,或切換該連接之省略圖示的連接電路。The inspection unit 4 includes a connection circuit, which is not shown in the drawings, for electrically connecting the contact terminals Pr of the inspection jig 3 and the inspection processing unit 8 through the test head 37 and the connecting plate 35 or switching the connection.

藉此,檢查處理部8係可對於任意的接觸端子Pr供給檢查用訊號,或從任意的接觸端子Pr檢測出訊號。Thereby, the inspection processing unit 8 can supply an inspection signal to an arbitrary contact terminal Pr, or can detect a signal from an arbitrary contact terminal Pr.

檢查處理部8係例如具備電源電路、電壓計、電流計、及微電腦等。檢查處理部8係控制省略圖示的驅動機構來移動、定位檢查部4,使各接觸端子Pr接觸檢查對象物101的各檢查點。藉此,電性連接各檢查點與檢查處理部8。The inspection processing unit 8 includes, for example, a power supply circuit, a voltmeter, an ammeter, a microcomputer, and the like. The inspection processing unit 8 controls a drive mechanism (not shown) to move and position the inspection unit 4 so that the contact terminals Pr are brought into contact with the inspection points of the inspection object 101 . Thereby, each inspection point and the inspection processing unit 8 are electrically connected.

檢查處理部8係在上述的狀態下透過檢查治具3的各接觸端子Pr對檢查對象物101的各檢查點供給檢查用的電流或電壓,依據從各接觸端子Pr所得之電壓或電流等的電性訊號,執行例如電路圖案的斷線或短路等之檢查對象物101的檢查。或者,檢查處理部8係作為藉由將交流的電流或電壓供給至各檢查點,依據從各接觸端子Pr所得之電壓或電流等的電性訊號,測定檢查對象的阻抗者亦可。The inspection processing unit 8 supplies current or voltage for inspection to each inspection point of the inspection object 101 through each of the contact terminals Pr of the inspection jig 3 in the above-described state, according to the voltage or current obtained from each of the contact terminals Pr, etc. For the electrical signal, inspection of the inspection object 101 such as disconnection or short circuit of the circuit pattern is performed. Alternatively, the inspection processing unit 8 may measure the impedance of the inspection object based on electrical signals such as voltage or current obtained from each contact terminal Pr by supplying alternating current or voltage to each inspection point.

圖2所示的支持構件31係例如藉由層積板狀的支持板31a、31b、31c所構成。以貫通支持板31a、31b、31c之方式,形成複數貫通孔。The support member 31 shown in FIG. 2 is comprised, for example by laminating|stacking the plate-shaped support plates 31a, 31b, 31c. A plurality of through holes are formed so as to penetrate through the support plates 31a, 31b, and 31c.

於支持板31a、31b,分別形成由所定直徑的開口孔所成的插通孔Ha。於位於與檢查對象即檢查對象物101對向之面側的支持板31c,形成孔徑比插通孔Ha小的小徑部Ha1。然後,藉由連通支持板31a、31b的插通孔Ha,與支持板31c的小徑部Ha1,形成貫通支持構件31的貫通孔。In the support plates 31a and 31b, insertion holes Ha formed by opening holes having a predetermined diameter are respectively formed. A small diameter portion Ha1 having a diameter smaller than that of the insertion hole Ha is formed on the support plate 31c located on the surface side facing the inspection target object 101 . Then, a through hole penetrating the support member 31 is formed by connecting the insertion hole Ha of the support plates 31a and 31b and the small diameter portion Ha1 of the support plate 31c.

再者,支持構件31並不限於層積板狀的支持板31a、31b、31c所構成的範例,作為例如於一體的構件,設置由插通孔Ha及小徑部Ha1所成的貫通孔的構造亦可。又,貫通孔的整體作為具有所定直徑的插通孔Ha的構造亦可。進而,代替相互層積支持構件31的支持板31a、31b的範例,作為在使支持板31a與支持板31b相互隔開之狀態下,例如藉由支柱等連結的構造亦可。In addition, the support member 31 is not limited to an example in which the plate-shaped support plates 31a, 31b, and 31c are laminated, and as an integral member, for example, a through hole formed by the insertion hole Ha and the small diameter portion Ha1 is provided. Structure is also possible. In addition, the entire through hole may be a structure having an insertion hole Ha of a predetermined diameter. Furthermore, instead of the example in which the support plates 31a and 31b of the support members 31 are stacked on each other, a structure in which the support plate 31a and the support plate 31b are separated from each other may be connected by, for example, a column.

於支持板31a的後端側,安裝有例如藉由絕緣性的樹脂材料所構成的連接板35。藉由該連接板35,封堵貫通孔的後端側開口部,亦即插通孔Ha的後端面。於連接板35,於與貫通孔的後端側開口部對向的位置中,以貫通連接板35之方式安裝配線34。以對向於支持板31a之連接板35的前面與配線34的端面成為相同面之方式設定。該配線34的端面作為電極34a。A connection plate 35 made of, for example, an insulating resin material is attached to the rear end side of the support plate 31a. The rear end side opening of the through hole, that is, the rear end face of the insertion hole Ha is blocked by the connecting plate 35 . The wiring 34 is attached to the connecting plate 35 so as to penetrate through the connecting plate 35 at a position facing the opening on the rear end side of the through hole. It is set so that the front surface of the connection board 35 which faces the support board 31a and the end surface of the wiring 34 may become the same surface. The end face of the wiring 34 serves as the electrode 34a.

配線34係作為絕緣被覆導電性線材的側面的索線從-Z往+Z方向貫通連接板35的跳線空間轉換器(Wired space transformer)亦可。或者,作為讓使用MLO (Multilayer Organic)或MLC(Multilayer Ceramic),由絕緣性的樹脂材料或陶瓷材料所成的基板內,以隨著從-Z方向朝向+Z方向,相互的距離階段性變小之方式圖案化形成的導電層亦可。The wiring 34 may be a wired space transformer that penetrates the connecting plate 35 in the direction from -Z to +Z as a wire on the side surface of the insulating-coated conductive wire. Alternatively, MLO (Multilayer Organic) or MLC (Multilayer Ceramic) is used, and in a substrate made of an insulating resin material or ceramic material, the mutual distance gradually changes from the -Z direction to the +Z direction. A conductive layer formed by patterning in a small manner can also be used.

於支持構件31的各貫通孔,接觸端子Pr分別插入且被支持。接觸端子Pr係具備藉由具有導電性的素材,形成為筒狀的筒狀體Pa,與藉由具有導電性的素材,形成為棒狀的第一、第二導體P1、P2。The contact terminals Pr are inserted into and supported by the respective through holes of the support member 31 . The contact terminal Pr is provided with a cylindrical body Pa formed in a cylindrical shape with a material having conductivity, and first and second conductors P1 and P2 formed in a rod shape with a material having conductivity.

作為筒狀體Pa、第一導體P1、第二導體P2的材料,可單獨或組合使用例如鈀、銅、銠、鎳及該等合金等。As the material of the cylindrical body Pa, the first conductor P1, and the second conductor P2, for example, palladium, copper, rhodium, nickel, and alloys thereof can be used alone or in combination.

參照圖2~圖5,筒狀體Pa可使用例如具有大約25~300μm的外徑與大約10~250μm的內徑的管子來形成。例如可將筒狀體Pa的外徑設為大約120μm、內徑射為大約100μm、全長設為大約3000μm。又,於筒狀體Pa的內周,施加由金或其合金所成之電鍍等的導體層亦可。藉由導體層,可提升筒狀體的導電性。又,設為因應必要,絕緣被覆筒狀體Pa的周面的構造亦可。2 to 5 , the cylindrical body Pa can be formed using, for example, a pipe having an outer diameter of about 25 to 300 μm and an inner diameter of about 10 to 250 μm. For example, the outer diameter of the cylindrical body Pa can be set to about 120 μm, the inner diameter can be set to about 100 μm, and the overall length can be set to about 3000 μm. In addition, a conductor layer such as electroplating made of gold or an alloy thereof may be applied to the inner circumference of the cylindrical body Pa. The conductivity of the cylindrical body can be improved by the conductor layer. Moreover, it may be set as the structure which insulating-covers the peripheral surface of the cylindrical body Pa as needed.

第一導體P1、第二導體P2係具有例如長度大約1000~3000μm、厚度大約8~250μm程度之整體大略棒狀的形狀。The first conductor P1 and the second conductor P2 have, for example, a generally rod-like shape as a whole with a length of about 1000 to 3000 μm and a thickness of about 8 to 250 μm.

於筒狀體Pa的+Z(一端)側,形成從筒狀體Pa的+Z側方向端部朝向筒狀體Pa的-Z方向(另一端)側延伸的一對第一縫隙SL1(圖3)。一對第一縫隙SL1係形成於與Y方向相對向的位置。於從各第一縫隙SL1的-Z側端部SL1a往+Z側隔開預先設定的第一距離D1的位置,形成第一縫隙SL1的寬度縮小的縮小部N1(圖4)。On the +Z (one end) side of the cylindrical body Pa, a pair of first slits SL1 (Fig. 3). A pair of 1st slit SL1 is formed in the position which opposes the Y direction. A narrowed portion N1 ( FIG. 4 ) in which the width of the first slit SL1 is reduced is formed at a position separated by a predetermined first distance D1 from the −Z side end SL1a of each first slit SL1 toward the +Z side.

各第一縫隙SL1的-Z側端部SL1a與縮小部N1之間的區域係作為承接部A1。於各第一縫隙SL1,形成連接於縮小部N1的+Z側,並且隨著朝向+Z側變得寬廣的漏斗狀部R1(圖5)。The area between the -Z side end part SL1a of each 1st slit SL1 and the narrowing part N1 serves as a receiving part A1. In each of the first slits SL1, a funnel-shaped portion R1 ( FIG. 5 ) that is connected to the +Z side of the narrowed portion N1 and widens toward the +Z side is formed.

於筒狀體Pa的-Z(另一端)側,形成從筒狀體Pa的-Z側方向端部朝向筒狀體Pa的+Z方向(一端)側延伸的一對第二縫隙SL2(圖3)。一對第二縫隙SL2係形成於與Y方向相對向的位置。於從第二縫隙SL2的+Z側端部SL2a往-Z側隔開預先設定的第一距離D1的位置,形成第二縫隙SL2的寬度縮小的縮小部N2(圖4)。On the -Z (the other end) side of the cylindrical body Pa, a pair of second slits SL2 (Fig. 3). A pair of 2nd slit SL2 is formed in the position which opposes the Y direction. A narrowed portion N2 ( FIG. 4 ) in which the width of the second slit SL2 is reduced is formed at a position separated by a predetermined first distance D1 from the +Z side end SL2a of the second slit SL2 to the −Z side.

縮小部N1、N2的寬度W5(圖10)係與後述的板狀突起B1、B2的厚度大略相同或稍微寬。The widths W5 ( FIG. 10 ) of the reduced portions N1 and N2 are substantially the same as or slightly wider than the thicknesses of the plate-shaped projections B1 and B2 to be described later.

各第二縫隙SL2的+Z側端部SL2a與縮小部N2之間的區域係作為承接部A2。於各第二縫隙SL2,形成分別連接於縮小部N2的-Z側,並且隨著朝向-Z側變得寬廣的漏斗狀部R2(圖5)。The region between the +Z side end portion SL2a of each second slit SL2 and the narrowing portion N2 serves as the receiving portion A2. In each of the second slits SL2, a funnel-shaped portion R2 ( FIG. 5 ) that is connected to the -Z side of the reduced portion N2 and widens toward the -Z side is formed.

筒狀體Pa係具備連接於第一縫隙SL1的-Z側的端部側筒部PP1、連接於端部側筒部PP1的-Z側之螺旋狀的第一彈簧部Pe1、連接於第一彈簧部Pe1的-Z側的中央側筒部Pf(圖3、圖4)。筒狀體Pa係具備連接於第二縫隙SL2的+Z側的端部側筒部PP2、連接於端部側筒部PP2的+Z側之螺旋狀的第二彈簧部Pe2、連接於第二彈簧部Pe2的+Z側的中央側筒部Pf。The cylindrical body Pa includes an end-side cylindrical portion PP1 connected to the −Z side of the first slit SL1 , a helical first spring portion Pe1 connected to the −Z side of the end-side cylindrical portion PP1 , and a first spring portion Pe1 connected to the first slit SL1 . The center side cylinder part Pf on the -Z side of the spring part Pe1 (FIG. 3, FIG. 4). The cylindrical body Pa includes an end-side cylindrical portion PP2 connected to the +Z side of the second slit SL2, a helical second spring portion Pe2 connected to the +Z side of the end-side cylindrical portion PP2, and a second coiled spring portion Pe2 connected to the second slit SL2. The center-side cylindrical portion Pf on the +Z side of the spring portion Pe2.

第一導體P1整體具有延伸於Z方向的大略棒狀形狀。第一導體P1係具有於延伸成板狀之中心板部PL1的X方向兩側層積一對狹窄板部PN1的形狀(圖5、圖6)。狹窄板部PN1係比中心板部PL1還狹窄。再者,第一導體P1只要具有層積中心板部PL1與一對狹窄板部PN1的形狀即可,中心板部PL1與一對狹窄板部PN1係作為一體的一構件形成亦可。The first conductor P1 has a substantially rod-like shape extending in the Z direction as a whole. The first conductor P1 has a shape in which a pair of narrow plate portions PN1 are stacked on both sides in the X direction of the center plate portion PL1 extending in a plate shape ( FIGS. 5 and 6 ). The narrow plate portion PN1 is narrower than the center plate portion PL1. Furthermore, the first conductor P1 may have a shape in which the center plate portion PL1 and the pair of narrow plate portions PN1 are stacked, and the center plate portion PL1 and the pair of narrow plate portions PN1 may be formed as one integral member.

第一導體P1係具有位於筒狀體Pa的+Z側的筒內的棒狀本體Pb1,與從筒狀體Pa的+Z側端部(一端)突出的外部導體部Pc1(圖3)。The first conductor P1 has a rod-shaped body Pb1 located in the cylinder on the +Z side of the cylindrical body Pa, and an outer conductor portion Pc1 protruding from the +Z side end (one end) of the cylindrical body Pa ( FIG. 3 ).

棒狀本體Pb1係中心板部PL1因為Y方向兩側變得寬廣而突出於各縮小部N1內之位於Y方向的一對板狀突起B1(圖6、圖5)。板狀突起B1的-Z(另一端)側壁面KW1係與第一縫隙SL1的-Z側端部SL1a相互卡住。藉此,可定位對於筒狀體Pa的第一導體P1的插入位置。The center plate portion PL1 of the rod-shaped body Pb1 is widened on both sides in the Y direction, and protrudes from a pair of plate-like protrusions B1 located in the Y direction in each narrowing portion N1 ( FIGS. 6 and 5 ). The -Z (the other end) side wall surface KW1 of the plate-like protrusion B1 and the -Z side end SL1a of the first slit SL1 are engaged with each other. Thereby, the insertion position of the 1st conductor P1 with respect to the cylindrical body Pa can be located.

又,板狀突起B1的Y方向的寬度W3係大於支持板31c的小徑部Ha1的內徑。藉此,板狀突起B1的+Z側壁面B1W抵接於支持板31c的-Z側之面,讓第一導體P1不會從支持板31c脫落。另一方面,板狀突起B1的-Z側壁面KW1係抵接於-Z側端部SL1a。結果,藉由第一彈簧部Pe1與第二彈簧部Pe2的彈撥力,+Z側壁面B1W彈性壓接於支持板31c的-Z側之面,-Z側壁面KW1彈性壓接於-Z側端部SL1a。結果,可穩定地保持第一導體P1。又,穩定化第一導體P1與筒狀體Pa的導通。In addition, the width W3 of the plate-shaped protrusion B1 in the Y direction is larger than the inner diameter of the small-diameter portion Ha1 of the support plate 31c. Thereby, the +Z side wall surface B1W of the plate-like protrusion B1 abuts on the -Z side surface of the support plate 31c, so that the first conductor P1 does not come off from the support plate 31c. On the other hand, the -Z side wall surface KW1 of the plate-like protrusion B1 is in contact with the -Z side end portion SL1a. As a result, the +Z side wall surface B1W is elastically pressed against the -Z side surface of the support plate 31c, and the -Z side wall surface KW1 is elastically pressed against the -Z side by the spring force of the first spring portion Pe1 and the second spring portion Pe2. end SL1a. As a result, the first conductor P1 can be stably held. In addition, the conduction between the first conductor P1 and the cylindrical body Pa is stabilized.

進而,棒狀本體Pb1係包含藉由於板狀突起B1的X方向兩側中狹窄板部PN1於Y方向兩側變寬廣,於筒狀體Pa的各承接部A1內,突出於Y方向(第二方向)兩側的一對卡合部K1。以卡合部K1的頂部比筒狀體Pa的內周面,更具體來說是位於縮小部N1的筒狀體Pa的內周面更往外周側突出之方式,設定卡合部K1的突出量。藉此,使卡合部K1突出至可與縮小部N1相互卡住的位置為止。Furthermore, the rod-shaped body Pb1 includes the narrow plate portions PN1 on both sides in the X direction of the plate-shaped protrusions B1 that are widened on both sides in the Y direction, and protrude in the Y direction in each receiving portion A1 of the cylindrical body Pa (No. A pair of engaging parts K1 on both sides in two directions). The protrusion of the engaging portion K1 is set so that the top portion of the engaging portion K1 protrudes further to the outer peripheral side than the inner peripheral surface of the cylindrical body Pa, more specifically, the inner peripheral surface of the cylindrical body Pa located in the reduced portion N1. quantity. Thereby, the engaging part K1 is made to protrude to the position which can mutually engage with the reduction part N1.

於各卡合部K1的-Z(另一端)側,形成突出量隨著朝向-Z側減少的傾斜面KS1。On the -Z (other end) side of each engaging portion K1, an inclined surface KS1 whose protrusion amount decreases toward the -Z side is formed.

棒狀本體Pb1的前端係位於中央側筒部Pf內(圖3)。藉此,在檢查時第一彈簧部Pe1及第二彈簧部Pe2伸縮之狀況中,也可減低棒狀本體Pb1的前端卡住第一彈簧部Pe1或第二彈簧部Pe2之虞。The front end of the rod-shaped body Pb1 is located in the center-side cylindrical portion Pf ( FIG. 3 ). Thereby, even when the first spring portion Pe1 and the second spring portion Pe2 expand and contract during inspection, it is possible to reduce the risk that the front end of the rod-shaped body Pb1 gets caught in the first spring portion Pe1 or the second spring portion Pe2.

棒狀本體Pb1係包含位於端部側筒部PP1內的寬廣部PW1,與位於第一彈簧部Pe1內的狹窄部PS1(圖6)。狹窄部PS1的寬度W1係比寬廣部PW1的寬度W2窄。The rod-shaped body Pb1 includes a wide portion PW1 located in the end-side cylindrical portion PP1 and a narrow portion PS1 located in the first spring portion Pe1 ( FIG. 6 ). The width W1 of the narrow portion PS1 is narrower than the width W2 of the wide portion PW1.

寬廣部PW1的寬度W2係與筒狀體Pa(端部側筒部PP1)的內徑大略相同或稍微小。藉此,可減低對於筒狀體Pa,第一導體P1往Y方向搖動(晃動)之虞。進而,在圖2所示的範例中,各接觸端子Pr的筒狀體Pa相互之間係利用支持板31a、31c的壁部區隔,但是,也可採用筒狀體Pa相互之間並未利用壁部區隔的構造。採用此種構造,即使將複數接觸端子Pr相互以狹小的間隔設置於檢查治具3之狀況中,也可藉由設置寬廣部PW1,減低鄰接之接觸端子Pr的筒狀體Pa彼此接觸之虞。The width W2 of the wide portion PW1 is substantially the same as or slightly smaller than the inner diameter of the cylindrical body Pa (the end-side cylindrical portion PP1 ). Thereby, the possibility that the 1st conductor P1 shakes (wobbling) in the Y direction with respect to the cylindrical body Pa can be reduced. Furthermore, in the example shown in FIG. 2, the cylindrical bodies Pa of the respective contact terminals Pr are separated from each other by the walls of the support plates 31a and 31c, but the cylindrical bodies Pa may not be separated from each other. Construction using wall partitions. With such a structure, even if the plurality of contact terminals Pr are provided in the inspection jig 3 at a narrow interval, the provision of the wide portion PW1 can reduce the possibility that the cylindrical bodies Pa of the adjacent contact terminals Pr come into contact with each other. .

另一方面,位於第一彈簧部Pe1內的狹窄部PS1的寬度W1係小於寬度W2,所以,可確保筒狀體Pa(第一彈簧部Pe1)的內面與狹窄部PS1的間隔。結果,在檢查時第一彈簧部Pe1伸縮之狀況中,也可減低狹窄部PS1與第一彈簧部Pe1摩擦導致耗損之虞。進而,位於第一彈簧部Pe1內的狹窄部PS1可抑制第一彈簧部Pe1的伸縮時之屈曲。On the other hand, since the width W1 of the narrow portion PS1 in the first spring portion Pe1 is smaller than the width W2, the interval between the inner surface of the cylindrical body Pa (first spring portion Pe1) and the narrow portion PS1 can be secured. As a result, even when the first spring portion Pe1 expands and contracts during inspection, it is possible to reduce the risk of wear caused by friction between the narrow portion PS1 and the first spring portion Pe1. Furthermore, the narrow part PS1 located in the 1st spring part Pe1 can suppress the buckling at the time of expansion-contraction of the 1st spring part Pe1.

狹窄板部PN1係進而包含在比縮小部N1更靠+Z(一端)側的位置,比位於縮小部N1的部分更寬廣的擴大部EX1(圖5)。在位於縮小部N1的部分中,狹窄板部PN1係為了迴避與第一縫隙SL1的縮小部N1的相互卡住,寬度變窄。假設,與狹窄板部PN1位於縮小部N1的部分相同寬度之狀態下延伸於+Z方向時,狹窄板部PN1與漏斗狀部R1之間的間隔變寬,故筒狀體Pa會變得對於第一導體P1相對地容易往X方向搖動(鬆動)。The narrow plate portion PN1 further includes an enlarged portion EX1 ( FIG. 5 ) that is located on the +Z (one end) side of the narrowed portion N1 and is wider than a portion located in the narrowed portion N1 . In the portion located in the narrowed portion N1, the narrow plate portion PN1 is narrowed in width in order to avoid mutual jamming with the narrowed portion N1 of the first slit SL1. Assuming that when the narrowed plate portion PN1 extends in the +Z direction with the same width as the portion of the narrowed plate portion PN1 located in the narrowed portion N1, the interval between the narrowed plate portion PN1 and the funnel-shaped portion R1 is widened, so that the cylindrical body Pa becomes relatively large. The first conductor P1 is relatively easy to shake (loose) in the X direction.

在圖2所示的範例中,各接觸端子Pr的筒狀體Pa相互之間係利用支持板31a、31b的壁部區隔,但是,採用筒狀體Pa相互之間並未利用壁部區隔的構造時,筒狀體Pa對於第一導體P1鬆動於X方向的話,鄰接之筒狀體Pa彼此接觸之虞會增大。In the example shown in FIG. 2 , the cylindrical bodies Pa of the respective contact terminals Pr are separated from each other by the wall portions of the support plates 31a and 31b, but the cylindrical bodies Pa are not separated from each other by the wall portion. If the cylindrical body Pa becomes loose in the X direction with respect to the first conductor P1 at the time of the partitioned structure, there is an increased possibility that the adjacent cylindrical bodies Pa come into contact with each other.

另一方面,在比縮小部N1更靠+Z(一端)側的位置中,即使增加狹窄板部PN1的寬度,也不會與縮小部N1相互卡住。因此,藉由設置擴大部EX1,可一邊迴避與縮小部N1的相互卡住,一邊減低筒狀體Pa之X方向的鬆動,可減少鄰接之筒狀體Pa彼此接觸之虞。On the other hand, at a position on the +Z (one end) side of the narrowed portion N1, even if the width of the narrowed plate portion PN1 is increased, the narrowed portion N1 does not get caught with each other. Therefore, by providing the enlarged portion EX1, the looseness in the X direction of the cylindrical body Pa can be reduced while avoiding the mutual jamming with the narrowed portion N1, and the possibility that the adjacent cylindrical bodies Pa come into contact with each other can be reduced.

第二導體P2整體具有延伸於Z方向的大略棒狀形狀。第二導體P2係包含大略地使第一導體P1的外部導體部Pc1之除了前端形狀外的部分旋轉180度(替換+Z與-Z)之形狀。The second conductor P2 has a substantially rod-like shape extending in the Z direction as a whole. The second conductor P2 includes a shape that roughly rotates the portion of the outer conductor portion Pc1 of the first conductor P1 excluding the front end shape by 180 degrees (replacement of +Z and -Z).

亦即,如圖3~圖7所示,第二導體P2所具備的中心板部PL2、狹窄板部PN2、狹窄部PS2、寬廣部PW2、板狀突起B2、+Z側壁面KW2、-Z側壁面B2W、卡合部K2、傾斜面KS2、及擴大部EX2的各部,係具有分別對應第一導體P1的中心板部PL1、狹窄板部PN1、狹窄部PS1、寬廣部PW1、板狀突起B1、-Z側壁面KW1、+Z側壁面B1W、卡合部K1、傾斜面KS1、及擴大部EX1的各部之形狀。結果,第二導體P2的各部可發揮與第一導體P1的各部相同的效果。That is, as shown in FIGS. 3 to 7 , the center plate portion PL2 , the narrow plate portion PN2 , the narrow portion PS2 , the wide portion PW2 , the plate-like protrusions B2 , the +Z side wall surfaces KW2 , and −Z included in the second conductor P2 Each of the side wall surface B2W, the engaging portion K2, the inclined surface KS2, and the enlarged portion EX2 has a center plate portion PL1, a narrow plate portion PN1, a narrow portion PS1, a wide portion PW1, and a plate-like protrusion corresponding to the first conductor P1, respectively. B1, -Z side wall surface KW1, +Z side wall surface B1W, engagement portion K1, inclined surface KS1, and the shape of each portion of the enlarged portion EX1. As a result, the respective portions of the second conductor P2 can exhibit the same effects as those of the respective portions of the first conductor P1.

接著,針對接觸端子Pr的製造方法進行說明。首先,針對筒狀體Pa的製造方法,一邊參照圖8~圖10一邊進行說明。圖9、圖10係兼用於第一縫隙SL1與第二縫隙SL2的形成方法的說明。在圖9、圖10、圖12、圖13中,以括弧揭示第二縫隙SL2相關的符號及方向。Next, the manufacturing method of the contact terminal Pr is demonstrated. First, the manufacturing method of the cylindrical body Pa is demonstrated, referring FIGS. 8-10. FIGS. 9 and 10 are also used for the description of the formation method of the 1st slit SL1 and the 2nd slit SL2. In FIGS. 9 , 10 , 12 and 13 , symbols and directions related to the second slit SL2 are shown in brackets.

首先,於導電性的筒狀構件即金屬管T的外壁面形成光阻(步驟S1:(b1))。First, a photoresist is formed on the outer wall surface of the metal tube T, which is a conductive cylindrical member (step S1: (b1)).

接著,於光阻,在將第一形狀F1與第二形狀F2隔開間隔W4的位置進行曝光(步驟S2:圖9:(b2))。Next, on the photoresist, exposure is performed at a position where the first shape F1 and the second shape F2 are separated by a distance W4 (step S2 : FIG. 9 : ( b2 )).

第一形狀F1係包含對向於X方向之一對的邊F11、F12一邊隨著朝向+Z(-Z)側逐漸接近,一邊匯合的第一部分F13的形狀。第二形狀F2係包含從金屬管T的端部E往-Z(+Z)方向延伸的第二部分F21,與連接於第二部分F21並且對向於X方向之一對的邊F22、F23一邊隨著朝向-Z (+Z)側逐漸接近,一邊匯合的第三部分F24的形狀。The first shape F1 is a shape including a first portion F13 in which the sides F11 and F12 facing a pair of the X direction are gradually approached toward the +Z (-Z) side and merge. The second shape F2 includes a second portion F21 extending from the end E of the metal tube T in the -Z (+Z) direction, and a pair of sides F22 and F23 connected to the second portion F21 and facing the X direction. The shape of the third portion F24 that merges while gradually approaching toward the -Z (+Z) side.

再者,第二部分F21係與第三部分F24相同,作為對向於X方向之一對的邊一邊隨著朝向-Z(+Z)側逐漸接近,一邊匯合的形狀亦可。In addition, the 2nd part F21 is the same as the 3rd part F24, and it may be a shape in which the pair of sides facing the X direction are gradually approached toward the -Z (+Z) side and converge.

接著,藉由對光阻進行顯影,去除曝光之第一形狀F1及第二形狀F2的部分的光阻,讓金屬管T的外壁面露出(步驟S3:(b3))。Next, by developing the photoresist, the exposed portions of the first shape F1 and the second shape F2 are removed to expose the outer wall surface of the metal tube T (step S3: (b3)).

接著,對該外壁面的露出部分進行蝕刻,並且到從對應第一形狀F1的第一部分F13的露出部分擴大去除的部分與從對應第二形狀F2的第三部分F24擴大去除的部分連通為止持續進行蝕刻(步驟S4:圖10:(b4))。Next, the exposed portion of the outer wall surface is etched until the portion enlarged and removed from the exposed portion of the first portion F13 corresponding to the first shape F1 communicates with the portion enlarged and removed from the third portion F24 corresponding to the second shape F2 Etching is performed (step S4: FIG. 10: (b4)).

於步驟S4中,對對應第一形狀F1及第二形狀F2的露出部分進行蝕刻的話,首先與金屬管T的周壁部於厚度方向被除去一事同步,腐蝕對應第一形狀F1及第二形狀F2的部分的周壁部。結果,形成比第一形狀F1稍微擴大的孔洞,與比第二形狀F2稍微擴大的缺口。進而持續蝕刻的話,對應第一形狀F1及第二形狀F2的外緣部分之部分的周壁部進一步被腐蝕,依照第一形狀F1的孔洞與依照第二形狀F2的缺口持續擴大。In step S4, if the exposed portions corresponding to the first shape F1 and the second shape F2 are etched, firstly in synchronization with the removal of the peripheral wall of the metal tube T in the thickness direction, the etching corresponding to the first shape F1 and the second shape F2 is performed first. part of the peripheral wall. As a result, a hole slightly larger than the first shape F1 and a notch slightly larger than the second shape F2 are formed. If the etching is continued, the peripheral wall portions corresponding to the outer edge portions of the first shape F1 and the second shape F2 are further corroded, and the holes according to the first shape F1 and the notch according to the second shape F2 continue to expand.

結果,從第一部分F13擴大去除的部分與從第三部分F24擴大去除的部分連通,形成承接部A1(A2)、縮小部N1(N2)、及漏斗狀部R1(R2)連接的第一縫隙SL1(第二縫隙SL2)。As a result, the part enlarged and removed from the first part F13 communicates with the part enlarged and removed from the third part F24, and a first slit connecting the receiving part A1 (A2), the narrowing part N1 (N2), and the funnel-shaped part R1 (R2) is formed SL1 (second slit SL2).

此時,縮小部N1(N2)的寬度W5係根據蝕刻的持續時間來決定,所以,容易將寬度W5設為微小的間隔。假設,於步驟S2中,初始以第一形狀F1與第二形狀F2連接的形狀,亦即縮小部N1(N2)的間隔隔開的形狀進行曝光時,需要持續進行蝕刻到至少去除金屬管T的周壁部的厚度為止。At this time, since the width W5 of the reduced portion N1 ( N2 ) is determined according to the duration of etching, it is easy to set the width W5 to a small interval. Assuming that, in step S2, when exposure is initially performed in a shape in which the first shape F1 and the second shape F2 are connected, that is, a shape in which the reduced portion N1 (N2) is spaced apart, the etching needs to be continued until at least the metal tube T is removed. up to the thickness of the peripheral wall.

在去除周壁部的厚度為止的蝕刻期間中,縮小部N1(N2)也同步承受腐蝕,寬度W5會擴大。如此,在對金屬管T的周壁部的厚度進行蝕刻的時間之間寬度W5會擴大,所以,難以將寬度W5形成為適切的微小間隔。During the etching period until the thickness of the peripheral wall portion is removed, the reduced portion N1 ( N2 ) is also etched simultaneously, and the width W5 is enlarged. In this way, the width W5 is enlarged during the time when the thickness of the peripheral wall portion of the metal tube T is etched, so that it is difficult to form the width W5 at an appropriate minute interval.

另一方面,依據本製造方法,以即使持續進行蝕刻到去除金屬管T的周壁部的厚度為止,第一形狀F1與第二形狀F2也不會連接,或寬度W5成為非常微小之方式,預先設定間隔W4。然後,藉由執行步驟S2~S4,可藉由無關於周壁部的厚度去除,控制蝕刻時間,形成所希望的微小寬度W5。On the other hand, according to the present manufacturing method, even if the etching is continued until the thickness of the peripheral wall portion of the metal tube T is removed, the first shape F1 and the second shape F2 are not connected, or the width W5 becomes very small. Set the interval W4. Then, by performing steps S2 to S4, the etching time can be controlled regardless of the thickness of the peripheral wall portion, and the desired minute width W5 can be formed.

可微小地形成寬度W5的話,容易讓筒狀體Pa變細,亦即讓接觸端子Pr變細。結果,容易檢查更微小的檢查對象。If the width W5 can be formed minutely, it is easy to make the cylindrical body Pa thin, that is, the contact terminal Pr can be made thin. As a result, it is easy to inspect a finer inspection object.

關於第一彈簧部Pe1及第二彈簧部Pe2,藉由於金屬管T的周壁部,利用蝕刻或雷射加工等各種加工方法,形成第一螺旋溝Pg1及第二螺旋溝Pg2,可形成第一彈簧部Pe1及第二彈簧部Pe2。Regarding the first spring portion Pe1 and the second spring portion Pe2, the first helical groove Pg1 and the second helical groove Pg2 can be formed by forming the first helical groove Pg1 and the second helical groove Pg2 on the peripheral wall portion of the metal tube T by various processing methods such as etching or laser processing. The spring portion Pe1 and the second spring portion Pe2.

再者,筒狀體Pa不具備漏斗狀部R1、R2亦可。以下,針對筒狀體Pa不具備漏斗狀部R1、R2時之筒狀體Pa的製造方法,一邊參照圖11~圖13一邊進行說明。In addition, the cylindrical body Pa does not need to have the funnel-shaped parts R1 and R2. Hereinafter, the manufacturing method of the cylindrical body Pa when the cylindrical body Pa does not have the funnel-shaped part R1, R2 is demonstrated, referring FIGS. 11-13.

首先,於導電性的筒狀構件即金屬管T的外壁面形成光阻(步驟S1a:(a1))。First, a photoresist is formed on the outer wall surface of the metal tube T, which is a conductive cylindrical member (step S1a: (a1)).

接著,在從金屬管T的端部隔開間隔W6的位置,於光阻曝光第一形狀F1(步驟S2a:圖12:(a2))。Next, the first shape F1 is exposed to the photoresist at a position separated from the end of the metal tube T by the interval W6 (step S2a: FIG. 12: (a2)).

接著,藉由對光阻進行顯影,去除曝光之第一形狀F1的部分的光阻,讓金屬管T的外壁面露出(步驟S3a:(a3))。Next, by developing the photoresist, the photoresist of the exposed portion of the first shape F1 is removed to expose the outer wall surface of the metal tube T (step S3a: (a3)).

接著,對該外壁面的露出部分進行蝕刻,並且到從對應第一形狀F1的第一部分F13的露出部分擴大且被除去的部分到達金屬管T的端部E為止持續進行蝕刻(步驟S4a:圖13:(a4))。Next, the exposed portion of the outer wall surface is etched, and the etching is continued until the portion expanded and removed from the exposed portion of the first portion F13 corresponding to the first shape F1 reaches the end E of the metal tube T (step S4a: Fig. 13: (a4)).

於步驟S4a中,對對應第一形狀F1的露出部分進行蝕刻的話,首先與金屬管T的周壁部於厚度方向被除去一事同步,腐蝕對應第一形狀F1的外緣部分之部分的周壁部。結果,形成比第一形狀F1稍微擴大的孔洞。進而持續蝕刻的話,對應第一形狀F1的外緣部分之部分的周壁部進一步被腐蝕,依照第一形狀F1的孔洞持續擴大。In step S4a, when etching the exposed portion corresponding to the first shape F1, the peripheral wall portion corresponding to the outer edge portion of the first shape F1 is etched in synchronization with the removal of the peripheral wall of the metal tube T in the thickness direction. As a result, a hole slightly enlarged than the first shape F1 is formed. If the etching is continued, the peripheral wall portion of the portion corresponding to the outer edge portion of the first shape F1 is further corroded, and the hole according to the first shape F1 continues to expand.

結果,從第一部分F13擴大去除的部分到達端部E,形成承接部A1(A2)及縮小部N1(N2),以形成第一縫隙SL1(第二縫隙SL2)。As a result, the portion expanded and removed from the first portion F13 reaches the end portion E to form the receiving portion A1 (A2) and the narrowing portion N1 (N2) to form the first slit SL1 (second slit SL2).

藉由步驟S2a~S4a,也與步驟S2~S4同樣地,以即使持續進行蝕刻到去除金屬管T的周壁部的厚度為止,第一形狀F1也不會到達,或寬度W5成為非常微小之方式,預先設定間隔W4。然後,藉由執行步驟S2a~S4a,可藉由無關於周壁部的厚度去除,控制蝕刻時間,形成所希望的微小寬度W5。By steps S2a to S4a, even if the etching is continued until the thickness of the peripheral wall portion of the metal tube T is removed, the first shape F1 is not reached, or the width W5 becomes very small, similarly to the steps S2 to S4. , and preset interval W4. Then, by performing steps S2a to S4a, the etching time can be controlled regardless of the thickness of the peripheral wall portion, and the desired minute width W5 can be formed.

接著,針對第一導體P1的製造方法進行說明。再者,第二導體P2係可與第一導體P1同樣地製造,所以省略其說明。第一導體P1的製造,可使用MEMS(Micro Electro Mechanical Systems)、微影、半導體製造、電鑄、及3D列印所致之立體成型等各種細微加工技術。Next, the manufacturing method of the 1st conductor P1 is demonstrated. In addition, since the 2nd conductor P2 can be manufactured similarly to 1st conductor P1, its description is abbreviate|omitted. The manufacture of the first conductor P1 may use various microfabrication techniques such as MEMS (Micro Electro Mechanical Systems), lithography, semiconductor manufacturing, electroforming, and three-dimensional molding by 3D printing.

參照圖14,使用如上所述的細微加工技術,首先作為第一層L1,形成一對狹窄板部PN1中一方(c1)。Referring to FIG. 14 , using the above-described microfabrication technique, first, as the first layer L1, one (c1) of the pair of narrow plate portions PN1 is formed.

接著,於第一層L1的狹窄板部PN1上,作為第二層L2層積中心板部PL1(c2)。接著,於第二層L2的中心板部PL1上,作為第三層L3層積一對狹窄板部PN1中另一方(c3)。Next, on the narrow plate portion PN1 of the first layer L1, the center plate portion PL1 (c2) is stacked as the second layer L2. Next, on the center plate portion PL1 of the second layer L2, the other (c3) of the pair of narrow plate portions PN1 is stacked as the third layer L3.

如此,第一導體P1(第二導體P2)係包含延伸成板狀之中心板部PL1(PL2)與比中心板部PL1(PL2)窄的一對狹窄板部PN1(PN2),且具有一對狹窄板部PN1(PN2)層積於中心板部PL1(PL2)的X方向兩側的形狀。結果,使用上述的細微加工技術,可容易形成板狀突起B1(B2)及卡合部K1(K2)等的細微構造。In this way, the first conductor P1 (second conductor P2) includes a central plate portion PL1 ( PL2 ) extending into a plate shape and a pair of narrow plate portions PN1 ( PN2 ) narrower than the central plate portion PL1 ( PL2 ), and has a A shape in which the narrow plate portion PN1 ( PN2 ) is stacked on both sides in the X direction of the central plate portion PL1 ( PL2 ). As a result, the fine structures of the plate-like protrusions B1 ( B2 ) and the engaging portions K1 ( K2 ) and the like can be easily formed using the above-described microfabrication technique.

第一導體P1(第二導體P2)係具有一對狹窄板部PN1(PN2)層積於中心板部PL1(PL2)的X方向兩側的形狀,所以,垂直於接觸端子Pr的軸方向的剖面係如圖15所示。藉由該形狀,收容於筒狀體Pa內的第一導體P1(第二導體P2)的剖面積係相較於剖面形狀為正方形之狀況更為增大。結果,變得可容易減低接觸端子Pr的電阻。The first conductor P1 (second conductor P2) has a shape in which a pair of narrow plate portions PN1 ( PN2 ) are stacked on both sides of the central plate portion PL1 ( PL2 ) in the X direction, so that the direction perpendicular to the axial direction of the contact terminal Pr is formed. The cross section is shown in Figure 15. With this shape, the cross-sectional area of the first conductor P1 (the second conductor P2 ) accommodated in the cylindrical body Pa becomes larger than that in the case where the cross-sectional shape is square. As a result, it becomes possible to easily reduce the resistance of the contact terminal Pr.

接著,針對接觸端子Pr的組裝方法,一邊參照圖4~圖6一邊進行說明。首先,準備如上所述般製造的筒狀體Pa、第一導體P1、及第二導體P2。接著,從筒狀體Pa的+Z側端部插入第一導體P1的-Z側端部。此時,從狹窄的狹窄部PS1先插入筒狀體Pa,所以,可順利地將第一導體P1插入筒狀體Pa。Next, a method of assembling the contact terminal Pr will be described with reference to FIGS. 4 to 6 . First, the cylindrical body Pa, the 1st conductor P1, and the 2nd conductor P2 manufactured as mentioned above are prepared. Next, the −Z side end portion of the first conductor P1 is inserted from the +Z side end portion of the cylindrical body Pa. At this time, since the cylindrical body Pa is first inserted from the narrow narrowed portion PS1, the first conductor P1 can be smoothly inserted into the cylindrical body Pa.

接著,板狀突起B1的-Z側壁面KW1到達筒狀體Pa的+Z側端部的話,-Z側壁面KW1與漏斗狀部R1會相互卡住。漏斗狀部R1係連接於縮小部N1的+Z側,隨著朝向+Z側會變寬,所以,-Z側壁面KW1與漏斗狀部R1相互卡住後也持續插入第一導體P1的話,-Z側壁面KW1被導引向縮小部N1,-Z側壁面KW1通過縮小部N1,板狀突起B1位於縮小部N1的間隔內。Next, when the −Z side wall surface KW1 of the plate-shaped protrusion B1 reaches the +Z side end of the cylindrical body Pa, the −Z side wall surface KW1 and the funnel-shaped portion R1 are caught with each other. The funnel-shaped portion R1 is connected to the +Z side of the narrowed portion N1 and widens as it goes to the +Z side. Therefore, if the -Z side wall surface KW1 and the funnel-shaped portion R1 are locked in each other and the first conductor P1 is continuously inserted, The -Z side wall surface KW1 is guided to the narrowing portion N1, the -Z side wall surface KW1 passes through the narrowing portion N1, and the plate-like protrusions B1 are located within the interval of the narrowing portion N1.

藉此,可將卡合部K1的位置,定位於可對於縮小部N1相互卡住之適切的位置。Thereby, the position of the engaging portion K1 can be positioned at an appropriate position where the narrowing portion N1 can be mutually locked.

進而,持續插入第一導體P1的話,卡合部K1的傾斜面KS1從內側抵接於縮小部N1,對於縮小部N1,傾斜面KS1一邊滑動一邊將縮小部N1朝外周方向推頂,卡合部K1會超過縮小部N1而進入承接部A1內。Further, when the first conductor P1 is continuously inserted, the inclined surface KS1 of the engaging portion K1 abuts the narrowed portion N1 from the inside, and the inclined surface KS1 pushes the narrowed portion N1 toward the outer circumferential direction while sliding with respect to the narrowed portion N1, and engages with the narrowed portion N1. The portion K1 goes beyond the reduced portion N1 and enters the receiving portion A1.

如此,藉由於卡合部K1設置傾斜面KS1,可讓卡合部K1順利位於承接部A1內。然後,藉由使卡合部K1位於承接部A1內,卡合部K1會與縮小部N1卡合,所以,變得可容易減低第一導體P1從筒狀體Pa脫落之虞。In this way, since the engaging portion K1 is provided with the inclined surface KS1, the engaging portion K1 can be smoothly positioned in the receiving portion A1. Then, by positioning the engaging portion K1 in the receiving portion A1, the engaging portion K1 is engaged with the narrowing portion N1, so that the risk of the first conductor P1 falling off the cylindrical body Pa can be easily reduced.

再者,卡合部K1、K2係只要可與縮小部N1、N2卡合即可,不一定具備傾斜面KS1、KS2亦可。In addition, the engaging parts K1 and K2 should just be able to engage with the reduction parts N1 and N2, and may not necessarily have the inclined surfaces KS1 and KS2.

進而,持續插入第一導體P1的話,板狀突起B1的-Z側壁面KW1係與第一縫隙SL1的-Z側端部SL1a相互卡住,定位第一導體P1對於筒狀體Pa的插入位置。此時,寬廣部PW1位於端部側筒部PP1內,故對於筒狀體Pa的內徑之寬廣部PW1的間隙變小,可減低對於筒狀體Pa,第一導體P1往Y方向搖動之虞。Further, when the first conductor P1 is continuously inserted, the -Z side wall surface KW1 of the plate-like protrusion B1 and the -Z side end SL1a of the first slit SL1 are locked with each other, and the insertion position of the first conductor P1 to the cylindrical body Pa is positioned. . At this time, since the wide portion PW1 is located in the end-side cylindrical portion PP1, the gap between the wide portion PW1 with respect to the inner diameter of the cylindrical body Pa is reduced, and the fluctuation of the first conductor P1 in the Y direction with respect to the cylindrical body Pa can be reduced. Yu.

第二導體P2係可與第一導體P1同樣地插入筒狀體Pa。The second conductor P2 can be inserted into the cylindrical body Pa similarly to the first conductor P1.

再者,第一導體P1及第二導體P2係例如圖16所示般,不具備擴大部EX1、EX2亦可,進而不具備板狀突起B1、B2亦可。In addition, as shown in FIG. 16, the 1st conductor P1 and the 2nd conductor P2 may not have the enlarged parts EX1, EX2, and may not have the plate-shaped protrusions B1, B2 further.

又,第一縫隙SL1、第二縫隙SL2、板狀突起B1、B2、卡合部K1、K2及擴大部EX1、EX2係已揭示各設置一對的範例,但作為各1個亦可。然而,藉由各具備一對,即使第一導體P1、第二導體P2旋轉180度,也可插入筒狀體Pa,所以,變得容易進行接觸端子Pr的組裝。In addition, the first slit SL1, the second slit SL2, the plate-like protrusions B1, B2, the engaging portions K1, K2, and the enlarged portions EX1, EX2 have been disclosed as an example in which a pair of each is provided, but one may be used for each. However, by providing a pair of each, even if the first conductor P1 and the second conductor P2 are rotated by 180 degrees, the cylindrical body Pa can be inserted, so that the assembly of the contact terminal Pr becomes easy.

又,接觸端子Pr不具備第二導體P2,筒狀體Pa不具備第二縫隙SL2亦可。又,筒狀體Pa不具備第一彈簧部Pe1、第二彈簧部Pe2、或中央側筒部Pf亦可。Moreover, the contact terminal Pr does not have the 2nd conductor P2, and the cylindrical body Pa does not need to have the 2nd slit SL2. Moreover, the cylindrical body Pa does not need to have the 1st spring part Pe1, the 2nd spring part Pe2, or the center side cylindrical part Pf.

亦即,本發明之一例的接觸端子,係具備:筒狀體,係具有導電性;及第一導體,係具有具有大略棒狀形狀,且位於前述筒狀體之一端側的筒內的棒狀本體,及從前述筒狀體的前述一端突出的外部導體部;形成從前述筒狀體的一端朝向前述筒狀體的另一端側延伸的第一縫隙;於從前述第一縫隙的前述另一端側的端部往前述一端側隔開預先設定的第一距離的位置,設置前述第一縫隙的寬度縮小的縮小部;前述棒狀本體,係包含位於前述第一縫隙之在前述另一端側的端部與前述縮小部之間的區域即承接部內,突出到朝向前述第一縫隙的寬度方向即第一方向及垂直於前述筒狀體的軸方向的第二方向可與前述縮小部相互卡住的位置為止的卡合部。That is, a contact terminal according to an example of the present invention includes: a cylindrical body having electrical conductivity; and a first conductor having a roughly rod-like shape and being located in the cylinder on one end side of the cylindrical body a body, and an outer conductor part protruding from the one end of the cylindrical body; a first slit extending from one end of the cylindrical body toward the other end side of the cylindrical body is formed; The end portion of one end side is separated from the first end side by a preset first distance, and a narrowed portion of which the width of the first slit is reduced is provided; the rod-shaped body includes a portion located on the other end side of the first slit. The area between the end of the slack and the shrinking portion, that is, the receiving portion, protrudes to the width direction of the first slit, that is, the first direction and the second direction perpendicular to the axial direction of the cylindrical body, and can be mutually engaged with the shrinking portion. The engaging part up to the living position.

依據該構造,位於承接部內的卡合部突出至可與縮小部相互卡住的位置為止,所以,第一導體欲從筒狀體脫離的話,縮小部與卡合部會相互卡住。結果,變得容易減低第一導體從筒狀體脫落之虞。According to this structure, the engaging portion in the receiving portion protrudes to a position where the narrowing portion and the narrowing portion can be engaged with each other. Therefore, when the first conductor is about to be detached from the cylindrical body, the narrowing portion and the engaging portion are locked with each other. As a result, it becomes easy to reduce the possibility that the first conductor falls off from the cylindrical body.

又,於前述卡合部的前述另一端側,形成突出量隨著朝向前述另一端側減少的傾斜面為佳。Moreover, it is preferable to form the inclined surface which the protrusion amount reduces toward the said other end side on the said other end side of the said engagement part.

依據該構造,在組裝接觸端子時,將第一導體插入筒狀體的話,卡合部的傾斜面從內側抵接於縮小部,對於縮小部,傾斜面一邊滑動一邊將縮小部朝外周方向推頂,卡合部會超過縮小部N1而進入承接部內。所以,變得容易進行接觸端子的組裝。According to this structure, when the first conductor is inserted into the cylindrical body when the contact terminal is assembled, the inclined surface of the engaging portion abuts against the narrowing portion from the inside, and the inclined surface pushes the narrowing portion toward the outer peripheral direction while sliding. At the top, the engaging portion will exceed the narrowing portion N1 and enter into the receiving portion. Therefore, it becomes easy to assemble the contact terminal.

又,前述第一縫隙,係進而包含連接於前述縮小部的前述一端側,並且隨著朝向前述一端側變得寬廣的漏斗狀部為佳。Moreover, it is preferable that the said 1st slit further includes the said one end side connected to the said narrow part, and it is preferable that the funnel-shaped part which becomes wider toward the said one end side is included.

依據該構造,在組裝接觸端子時,將第一導體插入筒狀體的話,卡合部會與漏斗狀部相互卡住。漏斗狀部係連接於縮小部的前述一端側,隨著朝向前述一端側會變寬,所以,卡合部與漏斗狀部相互卡住後也持續插入第一導體的話,卡合部會被導引向縮小部。藉此,可將卡合部的位置,定位於可對於縮小部相互卡住之適切的位置。According to this structure, when the first conductor is inserted into the cylindrical body when the contact terminal is assembled, the engaging portion and the funnel-shaped portion are mutually engaged. The funnel-shaped portion is connected to the one end side of the narrowing portion and widens toward the one end side. Therefore, if the engaging portion and the funnel-shaped portion are locked with each other and the first conductor is continuously inserted, the engaging portion will be guided. Lead to the reduction section. Thereby, the position of the engaging portion can be positioned at an appropriate position where the narrowing portions can be mutually locked.

又,前述筒狀體,係進而包含連接於前述第一縫隙的前述另一端側的端部側筒部,與連接於前述端部側筒部的前述另一端側之螺旋狀的彈簧部;前述棒狀本體,係進而包含位於前述端部側筒部內的寬廣部,與比前述寬廣部窄之位於前述彈簧部內的狹窄部為佳。In addition, the cylindrical body further includes an end-side cylindrical portion connected to the other end side of the first slit, and a coil-shaped spring portion connected to the other end side of the end-side cylindrical portion; the above-mentioned Preferably, the rod-shaped body further includes a wide portion located in the end-side cylindrical portion, and a narrow portion located in the spring portion narrower than the wide portion.

依據該構造,因為位於彈簧部內的狹窄部狹窄,彈簧部的內面與狹窄部之間的間隔會增大。結果,即使彈簧部伸縮之狀況中,也可減低狹窄部與彈簧部摩擦導致耗損之虞。另一方面,筒狀體之位於不伸縮的端部側筒部內的寬廣部,係比狹窄部還寬,故端部側筒部內面與寬廣部的間隔會變窄。結果,可減低對於筒狀體,第一導體往軸方向垂直搖動之虞。According to this configuration, since the narrow portion in the spring portion is narrow, the interval between the inner surface of the spring portion and the narrow portion is increased. As a result, even when the spring portion expands and contracts, it is possible to reduce the risk of wear between the narrow portion and the spring portion due to friction. On the other hand, since the wide portion of the cylindrical body located in the non-contractable end portion side cylindrical portion is wider than the narrow portion, the interval between the inner surface of the end portion side cylindrical portion and the wide portion is narrowed. As a result, it is possible to reduce the possibility that the first conductor will vibrate vertically in the axial direction with respect to the cylindrical body.

又,前述筒狀體,係進而包含連接於前述彈簧部的前述另一端側的中央側筒部;前述棒狀本體的前端,係位於前述中央側筒部內為佳。In addition, the cylindrical body further includes a central cylindrical portion connected to the other end side of the spring portion, and the front end of the rod-shaped body is preferably located in the central cylindrical portion.

依據該構造,棒狀本體的前端係迴避彈簧部而位於中央側筒部內。藉此,即使在檢查時彈簧部伸縮之狀況中,也可減低棒狀本體的前端卡住彈簧部之虞,進而,棒狀本體可抑制彈簧部的屈曲。According to this structure, the front end of the rod-shaped body avoids the spring part and is located in the center-side cylindrical part. Thereby, even in the state in which the spring portion expands and contracts during inspection, it is possible to reduce the possibility that the front end of the rod-shaped body gets caught in the spring portion, and further, the rod-shaped body can suppress the buckling of the spring portion.

又,前述第一縫隙,係於與前述第二方向相對向的位置形成一對;前述卡合部,係對應前述一對第一縫隙個別設置為佳。In addition, the first slits are formed as a pair at positions opposite to the second direction, and the engaging portions are preferably provided individually corresponding to the pair of first slits.

依據該構造,即使第一導體旋轉180度,也可插入筒狀體,所以,變得容易進行接觸端子的組裝。According to this structure, even if the first conductor is rotated 180 degrees, the cylindrical body can be inserted, so that the assembly of the contact terminal becomes easy.

又,前述第一導體,係進而包含板狀地突出於前述第二方向,位於前述縮小部內的板狀突起;前述卡合部,係分別設置於前述板狀突起的前述第一方向兩側為佳。In addition, the first conductor further includes plate-like protrusions protruding in the second direction and located in the narrowing portion; the engaging portions are respectively provided on both sides of the plate-like protrusions in the first direction. good.

依據該構造,藉由板狀突起位於縮小部內,可將卡合部的位置,定位於可對於縮小部相互卡住之適切的位置。According to this structure, since the plate-shaped protrusion is located in the narrowing portion, the position of the engaging portion can be positioned at an appropriate position where the narrowing portion can be locked with each other.

又,前述板狀突起的前述另一端側壁面,係與前述第一縫隙的前述另一端側端部相互卡住為佳。In addition, it is preferable that the other end side wall surface of the plate-like protrusion and the end portion of the other end side of the first slit are mutually locked.

依據該構造,藉由板狀突起的另一端側壁面與第一縫隙的另一端側端部相互卡住,可定位第一導體對於筒狀體的插入位置。According to this structure, the insertion position of the first conductor into the cylindrical body can be positioned by the other end side wall surface of the plate-shaped protrusion and the other end side end of the first slit being mutually locked.

又,前述第一導體,係包含延伸成板狀之中心板部與比前述中心板部窄的一對狹窄板部,且具有前述一對狹窄板部層積於前述中心板部的前述第一方向兩側的形狀;前述板狀突起,係具有前述中心板部在前述第二方向成為寬廣的形狀;前述卡合部,係具有前述一對狹窄板部在前述第二方向成為寬廣的形狀為佳。In addition, the first conductor includes a center plate portion extending into a plate shape and a pair of narrow plate portions narrower than the center plate portion, and has the first pair of narrow plate portions stacked on the center plate portion. The shape of the two sides in the direction; the plate-like protrusion has a shape in which the center plate portion becomes wide in the second direction; the engaging portion has a shape in which the pair of narrow plate portions widens in the second direction: good.

具有此種形狀的第一導體係容易藉由可層積形成的細微加工技術來製造。The first conductor system having such a shape can be easily produced by a microfabrication technique that can be formed in layers.

又,前述狹窄板部,係進而包含在比前述縮小部更靠前述一端側的位置,比位於前述縮小部的部分更寬廣的擴大部為佳。In addition, the narrow plate portion is further included in a position closer to the one end side than the narrowed portion, and preferably includes an enlarged portion wider than a portion located in the narrowed portion.

依據該構造,藉由在比縮小部更靠一端側之寬度難以被限制的位置,狹窄板部具有寬廣的擴大部,讓狹窄板部的導體剖面積變大。結果,變得容易減低第一導體的電阻值。According to this structure, the narrow plate portion has a wide enlarged portion at a position closer to the narrowed portion than the narrowed portion where the width of the one end side is difficult to be restricted, thereby increasing the conductor cross-sectional area of the narrowed plate portion. As a result, it becomes easy to reduce the resistance value of the first conductor.

又,於前述筒狀部,進而形成從前述筒狀體的前述另一端朝向前述一端側延伸,使前述第一縫隙旋轉180度之形狀的第二縫隙;於前述筒狀部的前述另一端側,進而安裝包含使前述第一導體的前述外部導體部之除了前端形狀外的部分旋轉180度之形狀的第二導體為佳。In addition, a second slit of a shape extending from the other end of the cylindrical body toward the one end side to rotate the first slit by 180 degrees is further formed in the cylindrical portion; on the other end side of the cylindrical portion Furthermore, it is preferable to mount a second conductor having a shape in which the outer conductor portion of the first conductor is rotated by 180 degrees except for the front end shape.

依據該構造,於筒狀體的兩端可安裝棒狀的導體。According to this structure, the rod-shaped conductor can be attached to both ends of the cylindrical body.

又,本發明之一例的檢查治具,係具備:上述的接觸端子,與支持前述接觸端子的支持構件。Further, an inspection jig according to an example of the present invention includes the above-mentioned contact terminal, and a support member for supporting the above-mentioned contact terminal.

依據該構造,可獲得使用容易減低導體從筒狀體脫落之虞的接觸端子的檢查治具。According to this structure, it is possible to obtain an inspection jig using a contact terminal that can easily reduce the risk of the conductor falling off the cylindrical body.

又,本發明之一例的檢查裝置,係具備:上述的檢查治具,與依據藉由使前述接觸端子接觸設置於檢查對象的檢查點所得之電性訊號,進行前述檢查對象的檢查的檢查處理部。Further, an inspection apparatus according to an example of the present invention includes the above-mentioned inspection jig, and an inspection process for performing the inspection of the inspection object based on an electrical signal obtained by bringing the contact terminal into contact with an inspection point provided in the inspection object. department.

依據該構造,可獲得使用容易減低導體從筒狀體脫落之虞的接觸端子的檢查裝置。According to this structure, it is possible to obtain an inspection device using a contact terminal that can easily reduce the risk of the conductor falling off from the cylindrical body.

又,本發明之一例的筒狀體的製造方法,係上述的接觸端子之筒狀體的製造方法,其中:(a1)於導電性的筒狀的構件之外壁面形成光阻;(a2)於從前述外壁面的前述一端隔開的位置中於前述光阻曝光第一形狀;前述第一形狀,係包含對向於前述第一方向之一對的邊一邊隨著朝向前述一端側逐漸接近,一邊匯合的第一部分的形狀;(a3)去除前述光阻之前述曝光的部分;(a4)對前述光阻之前述被除去的部分中露出的前述外壁面進行蝕刻,並且到從前述第一部分擴大且被除去的部分到達前述筒狀的構件的前述一端以形成前述縮小部為止持續前述蝕刻。In addition, a method of manufacturing a cylindrical body according to an example of the present invention is the method of manufacturing a cylindrical body of the above-mentioned contact terminal, wherein: (a1) a photoresist is formed on the outer wall surface of the conductive cylindrical member; (a2) A first shape is exposed to the photoresist at a position separated from the one end of the outer wall surface; the first shape includes a pair of sides facing the first direction gradually approaching toward the one end side , the shape of the first part that converges on one side; (a3) remove the previously exposed part of the photoresist; (a4) etch the outer wall surface exposed in the removed part of the photoresist, and from the first part The etching is continued until the enlarged and removed portion reaches the one end of the cylindrical member to form the narrowed portion.

又,本發明之一例的筒狀體的製造方法,係上述的接觸端子之筒狀體的製造方法,其中:(b1)於導電性的筒狀的構件之外壁面形成光阻;(b2)將第一形狀,與從前述第一形狀隔開的第二形狀曝光於前述光阻;前述第一形狀,係包含對向於前述第一方向之一對的邊一邊隨著朝向前述一端側逐漸接近,一邊匯合的第一部分的形狀;前述第二形狀,係包含從前述外壁面的前述一端往前述另一端方向延伸的第二部分,與連接於前述第二部分並且對向於前述第一方向之一對的邊一邊隨著朝向前述另一端側逐漸接近,一邊匯合的第三部分的形狀;(b3)去除前述光阻之前述曝光的部分;(b4)對前述光阻之前述被除去的部分中露出的前述外壁面進行蝕刻,並且從前述第一部分擴大且被除去的部分與從前述第三部分擴大去除的部分連通以形成前述縮小部及前述漏斗狀部為止持續前述蝕刻。In addition, a method for producing a cylindrical body according to an example of the present invention is the above-mentioned method for producing a cylindrical body of a contact terminal, wherein: (b1) a photoresist is formed on the outer wall surface of the conductive cylindrical member; (b2) A first shape and a second shape spaced from the first shape are exposed to the photoresist; the first shape includes a pair of sides facing the first direction as it goes toward the one end side gradually The shape of the first part that is close to and converged on one side; the second shape includes a second part extending from the one end of the outer wall surface to the direction of the other end, and a second part connected to the second part and facing the first direction. The shape of the third portion where one pair of sides is gradually approached toward the other end side and converges; (b3) the exposed portion of the photoresist is removed; (b4) the removed portion of the photoresist The portion of the outer wall surface exposed in the portion is etched, and the portion enlarged and removed from the first portion communicates with the portion enlarged and removed from the third portion to form the narrowed portion and the funnel-shaped portion.

依據該等製造方法,可將上述的筒狀體之縮小部,形成細微的間隔。According to these manufacturing methods, the narrowed portion of the above-mentioned cylindrical body can be formed at fine intervals.

又,本發明之一例的第一導體的製造方法,係上述的接觸端子之第一導體的製造方法,其中:(c1)形成前述一對狹窄板部中一方;(c2)於前述一方之狹窄板部上層積前述中心板部;(c3)於前述中心板部上層積前述一對的狹窄板部中另一方。In addition, a method of manufacturing a first conductor according to an example of the present invention is the method of manufacturing a first conductor of the above-mentioned contact terminal, wherein: (c1) one of the pair of narrow plate portions is formed; (c2) the narrow portion of the one is formed. The center plate portion is stacked on the plate portion; (c3) the other of the pair of narrow plate portions is stacked on the center plate portion.

依據該製造方法,可容易製造上述的第一導體。According to this manufacturing method, the above-described first conductor can be easily manufactured.

1:檢查裝置 3:檢查治具 4:檢查部 6a:載置部 6:試料台 8:檢查處理部 31a,31b,31c:支持板 31:支持構件 34a:電極 34:配線 35:連接板 37:測試頭 101:檢查對象物 A1,A2:承接部 B1,B2:板狀突起 B1W:+Z側壁面 B2W:-Z側壁面 D1:第一距離 E:端部 EX1,EX2:擴大部 F1:第一形狀 F11,F12,F22,F23:邊 F13:第一部分 F2:第二形狀 F21:第二部分 F24:第三部分 Ha:插通孔 Ha1:小徑部 K1,K2:卡合部 KS1,KS2:傾斜面 KW1:-Z側壁面 KW2:+Z側壁面 L1:第一層 L2:第二層 L3:第三層 N1,N2:縮小部 P1:第一導體 P2:第二導體 P2A:-Z端部 Pa:筒狀體 Pb1,Pb2:棒狀本體 Pc1,Pc2:外部導體部 Pe1:第一彈簧部(彈簧部) Pe2:第二彈簧部(彈簧部) Pf:中央側筒部 Pg1:第一螺旋溝 Pe2:第二螺旋溝 PL1,PL2:中心板部 PN1,PN2:狹窄板部 PP1,PP2:端部側筒部 Pr:接觸端子 PS1,PS2:狹窄部 PW1,PW2:寬廣部 R1,R2:漏斗狀部 SL1:第一縫隙 SL1a:-Z側端部 SL2:第二縫隙 SL2a:+Z側端部 T:金屬管 W1,W2,W3,W4,W5:寬度 W6:間隔1: Inspection device 3: Check the fixture 4: Inspection Department 6a: Loading part 6: sample table 8: Check the processing department 31a, 31b, 31c: Support plate 31: Support Components 34a: Electrodes 34: Wiring 35: Connection board 37: Test head 101: Check the object A1, A2: Undertaking Department B1, B2: Plate-like protrusions B1W:+Z sidewall face B2W:-Z sidewall face D1: first distance E: end EX1, EX2: Expansion Department F1: First shape F11, F12, F22, F23: Edge F13: Part 1 F2: Second shape F21: Part II F24: Part III Ha: through hole Ha1: Small diameter section K1, K2: Engagement part KS1, KS2: inclined plane KW1:-Z sidewall face KW2:+Z side wall surface L1: first floor L2: second floor L3: The third floor N1, N2: reduction part P1: first conductor P2: Second conductor P2A:-Z end Pa: cylindrical body Pb1, Pb2: rod body Pc1, Pc2: Outer conductor part Pe1: The first spring part (spring part) Pe2: Second spring part (spring part) Pf: Central side cylinder Pg1: the first helical groove Pe2: the second helical groove PL1, PL2: Center plate part PN1, PN2: Narrow plate PP1, PP2: end side barrel Pr: Contact terminal PS1, PS2: Narrow part PW1, PW2: Wide part R1, R2: funnel SL1: first slit SL1a:-Z side end SL2: Second slit SL2a: +Z side end T: metal tube W1,W2,W3,W4,W5: width W6: Interval

[圖1]概略揭示本發明的一實施形態之具備接觸端子Pr的檢查裝置1的構造的概念圖。 [圖2]簡略化揭示圖1所示之檢查治具3的構造之一例的示意剖面圖。 [圖3]從X方向觀察接觸端子Pr的分解圖。 [圖4]從Y方向觀察接觸端子Pr的分解圖。 [圖5]第一縫隙SL1(第二縫隙SL2)附近的放大立體圖。 [圖6]第一導體P1的前視及側視圖。 [圖7]第二導體P2的前視及側視圖。 [圖8]揭示筒狀體Pa的製造方法之一例的流程圖。 [圖9]筒狀體Pa的製造方法的說明圖。 [圖10]藉由圖8所示的製造方法形成之第一縫隙SL1(第二縫隙SL2)的說明圖。 [圖11]揭示筒狀體Pa的變形例的製造方法之一例的流程圖。 [圖12]筒狀體Pa的變形例之製造方法的說明圖。 [圖13]藉由圖11所示的製造方法形成之第一縫隙SL1(第二縫隙SL2)的說明圖。 [圖14]第一導體P1的製造方法的說明圖。 [圖15]第一導體P1(第二導體P2)的剖面圖。 [圖16]變形例的第一縫隙SL1(第二縫隙SL2)附近的放大立體圖。1 is a conceptual diagram schematically showing the structure of an inspection apparatus 1 provided with a contact terminal Pr according to an embodiment of the present invention. [ Fig. 2] Fig. 2 is a schematic cross-sectional view schematically showing an example of the structure of the inspection jig 3 shown in Fig. 1 . [ Fig. 3 ] An exploded view of the contact terminal Pr viewed from the X direction. [ Fig. 4 ] An exploded view of the contact terminal Pr viewed from the Y direction. [ FIG. 5 ] An enlarged perspective view of the vicinity of the first slit SL1 (the second slit SL2 ). [ FIG. 6 ] Front and side views of the first conductor P1 . [ FIG. 7 ] Front and side views of the second conductor P2 . 8 is a flowchart showing an example of a method of manufacturing the cylindrical body Pa. [ Fig. 9] Fig. 9 is an explanatory diagram of a method of manufacturing the cylindrical body Pa. [Fig. [ FIG. 10 ] An explanatory diagram of the first slit SL1 (second slit SL2 ) formed by the manufacturing method shown in FIG. 8 . 11 is a flowchart showing an example of a manufacturing method of a modification of the cylindrical body Pa. [ Fig. 12] Fig. 12 is an explanatory view of a manufacturing method of a modification of the cylindrical body Pa. [Fig. [ FIG. 13 ] An explanatory diagram of the first slit SL1 (second slit SL2 ) formed by the manufacturing method shown in FIG. 11 . [ Fig. 14 ] An explanatory diagram of a method of manufacturing the first conductor P1. [ FIG. 15 ] A cross-sectional view of the first conductor P1 (the second conductor P2 ). [ FIG. 16 ] An enlarged perspective view of the vicinity of the first slit SL1 (second slit SL2 ) according to the modification.

A1,A2:承接部A1, A2: Undertaking Department

B1,B2:板狀突起B1, B2: Plate-like protrusions

B1W:+Z側壁面B1W:+Z sidewall face

B2W:-Z側壁面B2W:-Z sidewall face

EX1,EX2:擴大部EX1, EX2: Expansion Department

K1,K2:卡合部K1, K2: Engagement part

KS1,KS2:傾斜面KS1, KS2: inclined plane

KW1:-Z側壁面KW1:-Z sidewall face

KW2:+Z側壁面KW2:+Z side wall surface

N1,N2:縮小部N1, N2: reduction part

P1:第一導體P1: first conductor

P2:第二導體P2: Second conductor

Pa:筒狀體Pa: cylindrical body

PL1,PL2:中心板部PL1, PL2: Center plate part

PN1,PN2:狹窄板部PN1, PN2: Narrow plate

PP1,PP2:端部側筒部PP1, PP2: end side barrel

R1,R2:漏斗狀部R1, R2: funnel

SL1:第一縫隙SL1: first slit

SL1a:-Z側端部SL1a:-Z side end

SL2:第二縫隙SL2: Second slit

SL2a:+Z側端部SL2a: +Z side end

Claims (16)

一種接觸端子,其特徵為具備: 筒狀體,係具有導電性;及 第一導體,係具有具有大略棒狀形狀,且位於前述筒狀體之一端側的筒內的棒狀本體,及從前述筒狀體的前述一端突出的外部導體部; 形成從前述筒狀體的一端朝向前述筒狀體的另一端側延伸的第一縫隙; 於從前述第一縫隙的前述另一端側的端部往前述一端側隔開預先設定的第一距離的位置,設置前述第一縫隙的寬度縮小的縮小部; 前述棒狀本體,係包含位於前述第一縫隙之在前述另一端側的端部與前述縮小部之間的區域即承接部內,突出到朝向與前述第一縫隙的寬度方向即第一方向及前述筒狀體的軸方向垂直的第二方向可與前述縮小部相互卡住的位置為止的卡合部。A contact terminal is characterized by having: a cylindrical body, which is electrically conductive; and The first conductor has a rod-shaped body having a roughly rod-like shape and is located in the cylinder on one end side of the cylindrical body, and an outer conductor portion protruding from the one end of the cylindrical body; forming a first slit extending from one end of the cylindrical body toward the other end side of the cylindrical body; a narrowing portion in which the width of the first slit is reduced is provided at a position separated by a predetermined first distance from the end of the first slit on the other end side to the one end side; The rod-shaped body includes a receiving portion located in a region between the end portion of the first slit on the other end side and the narrowing portion, and protrudes toward the width direction of the first slit, that is, the first direction and the aforementioned An engaging portion up to a position where the second direction perpendicular to the axial direction of the cylindrical body and the narrowing portion can be mutually engaged. 如請求項1所記載之接觸端子,其中, 於前述卡合部的前述另一端側,形成突出量隨著朝向前述另一端側減少的傾斜面。The contact terminal as described in claim 1, wherein, On the other end side of the engaging portion, an inclined surface whose protrusion amount decreases toward the other end side is formed. 如請求項1或2所記載之接觸端子,其中, 前述第一縫隙,係進而包含連接於前述縮小部的前述一端側,並且隨著朝向前述一端側變得寬廣的漏斗狀部。The contact terminal as described in claim 1 or 2, wherein, The first slit further includes a funnel-shaped portion that is connected to the one end side of the narrowing portion and that becomes wider toward the one end side. 如請求項1至3中任一項所記載之接觸端子,其中, 前述筒狀體,係進而包含連接於前述第一縫隙的前述另一端側的端部側筒部,與連接於前述端部側筒部的前述另一端側之螺旋狀的彈簧部; 前述棒狀本體,係進而包含位於前述端部側筒部內的寬廣部,與比前述寬廣部窄之位於前述彈簧部內的狹窄部。The contact terminal according to any one of claims 1 to 3, wherein, The cylindrical body further comprises an end-side cylindrical portion connected to the other end side of the first slit, and a coil-shaped spring portion connected to the other end side of the end-side cylindrical portion; The rod-shaped body further includes a wide portion located in the end-side cylindrical portion, and a narrow portion located in the spring portion narrower than the wide portion. 如請求項4所記載之接觸端子,其中, 前述筒狀體,係進而包含連接於前述彈簧部的前述另一端側的中央側筒部; 前述棒狀本體的前端,係位於前述中央側筒部內。The contact terminal as described in claim 4, wherein, The cylindrical body further includes a central cylindrical portion connected to the other end side of the spring portion; The front end of the rod-shaped body is located in the central cylindrical portion. 如請求項1至5中任一項所記載之接觸端子,其中, 前述第一縫隙,係於與前述第二方向相對向的位置形成一對; 前述卡合部,係對應前述一對第一縫隙個別設置。The contact terminal according to any one of claims 1 to 5, wherein, The first slits form a pair at positions opposite to the second direction; The aforementioned engaging portions are individually arranged corresponding to the aforementioned pair of first slits. 如請求項1至6中任一項所記載之接觸端子,其中, 前述第一導體,係進而包含板狀地突出於前述第二方向,位於前述縮小部內的板狀突起; 前述卡合部,係分別設置於前述板狀突起的前述第一方向兩側。The contact terminal according to any one of claims 1 to 6, wherein, The first conductor further includes a plate-shaped protrusion protruding in the second direction in a plate-like shape and located in the narrowing portion; The engaging portions are respectively disposed on both sides of the plate-shaped protrusion in the first direction. 如請求項7所記載之接觸端子,其中, 前述板狀突起的前述另一端側壁面,係與前述第一縫隙的前述另一端側端部相互卡住。The contact terminal according to claim 7, wherein, The side wall surface of the other end of the plate-shaped protrusion is locked with the end of the other end side of the first slit. 如請求項7或8所記載之接觸端子,其中, 前述第一導體,係包含延伸成板狀之中心板部與比前述中心板部窄的一對狹窄板部,且具有前述一對狹窄板部層積於前述中心板部的前述第一方向兩側的形狀; 前述板狀突起,係具有前述中心板部在前述第二方向成為寬廣的形狀; 前述卡合部,係具有前述一對狹窄板部在前述第二方向成為寬廣的形狀。The contact terminal as described in claim 7 or 8, wherein, The first conductor includes a center plate portion extending into a plate shape and a pair of narrow plate portions narrower than the center plate portion, and has the pair of narrow plate portions stacked on both sides of the first direction of the center plate portion. the shape of the side; The plate-like protrusion has a shape in which the center plate portion becomes wide in the second direction; The engaging portion has a shape in which the pair of narrow plate portions are widened in the second direction. 如請求項9所記載之接觸端子,其中, 前述狹窄板部,係進而包含在比前述縮小部更靠前述一端側的位置,比位於前述縮小部的部分更寬廣的擴大部。The contact terminal as described in claim 9, wherein, The narrow plate portion further includes an enlarged portion wider than a portion located in the narrowed portion at a position closer to the one end side than the narrowed portion. 如請求項1至10中任一項所記載之接觸端子,其中, 於前述筒狀部,進而形成從前述筒狀體的前述另一端朝向前述一端側延伸,使前述第一縫隙旋轉180度之形狀的第二縫隙; 於前述筒狀部的前述另一端側,進而安裝包含使前述第一導體的前述外部導體部之除了前端形狀外的部分旋轉180度之形狀的第二導體。The contact terminal according to any one of claims 1 to 10, wherein, In the cylindrical portion, a second slit in a shape extending from the other end of the cylindrical body toward the one end side and rotating the first slit by 180 degrees is further formed; On the other end side of the cylindrical portion, a second conductor having a shape in which the portion of the outer conductor portion of the first conductor other than the front end shape is rotated by 180 degrees is further attached. 一種檢查治具,其特徵為具備: 請求項1至11中任一項所記載之接觸端子;及 支持構件,係支持前述接觸端子。An inspection jig is characterized by having: The contact terminal described in any one of Claims 1 to 11; and The support member supports the aforementioned contact terminal. 一種檢查裝置,其特徵為具備: 請求項12所記載之檢查治具;及 檢查處理部,係依據藉由使前述接觸端子接觸設置於檢查對象的檢查點所得之電性訊號,進行前述檢查對象的檢查。An inspection device is characterized by having: The inspection jig described in claim 12; and The inspection processing unit performs the inspection of the inspection object based on the electrical signal obtained by bringing the contact terminal into contact with the inspection point provided in the inspection object. 一種筒狀體的製造方法,係請求項1至11中任一項所記載之接觸端子之筒狀體的製造方法,其特徵為: (a1)於導電性的筒狀的構件之外壁面形成光阻; (a2)於從前述外壁面的前述一端隔開的位置中於前述光阻曝光第一形狀; 前述第一形狀,係包含對向於前述第一方向之一對的邊一邊隨著朝向前述一端側逐漸接近,一邊匯合的第一部分的形狀; (a3)去除前述光阻之前述曝光的部分; (a4)對前述光阻之前述被除去的部分中露出的前述外壁面進行蝕刻,並且到從前述第一部分擴大且被除去的部分到達前述筒狀的構件的前述一端以形成前述縮小部為止持續前述蝕刻。A method for manufacturing a cylindrical body, which is the method for manufacturing a cylindrical body of a contact terminal according to any one of claims 1 to 11, characterized by: (a1) forming a photoresist on the outer wall surface of the conductive cylindrical member; (a2) exposing a first shape to the photoresist in a position spaced from the one end of the outer wall surface; The first shape includes a shape of a first portion in which the pair of sides facing the first direction are gradually approached toward the one end side and converge; (a3) removing the aforementioned exposed portion of the aforementioned photoresist; (a4) Etching the outer wall surface exposed in the removed portion of the photoresist, and continues until the portion enlarged and removed from the first portion reaches the end of the cylindrical member to form the narrowed portion The aforementioned etching. 一種筒狀體的製造方法,係請求項3所記載之接觸端子之筒狀體的製造方法,其特徵為: (b1)於導電性的筒狀的構件之外壁面形成光阻; (b2)將第一形狀,與從前述第一形狀隔開的第二形狀曝光於前述光阻; 前述第一形狀,係包含對向於前述第一方向之一對的邊一邊隨著朝向前述一端側逐漸接近,一邊匯合的第一部分的形狀; 前述第二形狀,係包含從前述外壁面的前述一端往前述另一端方向延伸的第二部分,與連接於前述第二部分並且對向於前述第一方向之一對的邊一邊隨著朝向前述另一端側逐漸接近,一邊匯合的第三部分的形狀; (b3)去除前述光阻之前述曝光的部分; (b4)對前述光阻之前述被除去的部分中露出的前述外壁面進行蝕刻,並且從前述第一部分擴大且被除去的部分與從前述第三部分擴大去除的部分連通以形成前述縮小部及前述漏斗狀部為止持續前述蝕刻。A method for manufacturing a cylindrical body, which is the method for manufacturing a cylindrical body of a contact terminal according to claim 3, characterized in that: (b1) forming a photoresist on the outer wall surface of the conductive cylindrical member; (b2) exposing a first shape and a second shape spaced from the first shape to the photoresist; The first shape includes a shape of a first portion in which the pair of sides facing the first direction are gradually approached toward the one end side and converge; The second shape includes a second portion extending from the one end of the outer wall in the direction of the other end, and a pair of sides connected to the second portion and facing the first direction as it goes toward the first direction. The shape of the third part where the other end gradually approaches, and one side converges; (b3) removing the aforementioned exposed portion of the aforementioned photoresist; (b4) Etching the outer wall surface exposed in the removed portion of the photoresist, and the enlarged and removed portion from the first portion communicates with the enlarged and removed portion from the third portion to form the reduced portion and The aforementioned etching is continued until the aforementioned funnel-shaped portion. 一種第一導體的製造方法,係請求項9或10所記載之接觸端子之第一導體的製造方法,其特徵為: (c1)形成前述一對狹窄板部中一方; (c2)於前述一方之狹窄板部上層積前述中心板部; (c3)於前述中心板部上層積前述一對的狹窄板部中另一方。A method for manufacturing a first conductor, which is the method for manufacturing a first conductor of a contact terminal as claimed in claim 9 or 10, characterized by: (c1) forming one of the pair of narrow plate portions; (c2) Laminating the center plate portion on the narrow plate portion of the one above; (c3) The other of the pair of narrow plate portions is stacked on the center plate portion.
TW110131991A 2020-09-11 2021-08-30 Contact terminal, inspection jig, inspection device, and manufacturing method TW202210838A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2020153002 2020-09-11
JP2020-153002 2020-09-11

Publications (1)

Publication Number Publication Date
TW202210838A true TW202210838A (en) 2022-03-16

Family

ID=80631863

Family Applications (1)

Application Number Title Priority Date Filing Date
TW110131991A TW202210838A (en) 2020-09-11 2021-08-30 Contact terminal, inspection jig, inspection device, and manufacturing method

Country Status (5)

Country Link
JP (1) JPWO2022054802A1 (en)
KR (1) KR20230065312A (en)
CN (1) CN116057683A (en)
TW (1) TW202210838A (en)
WO (1) WO2022054802A1 (en)

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4031007B2 (en) 2005-07-15 2008-01-09 日本電子材料株式会社 Vertical coil spring probe and probe unit using the same
JP4572303B1 (en) * 2010-02-12 2010-11-04 株式会社ルス・コム Method for manufacturing contact for electric current inspection jig, contact for electric current inspection jig manufactured thereby, and electric current inspection jig including the same
TWI555987B (en) * 2014-01-28 2016-11-01 Spring sleeve type probe and its manufacturing method
JP7114866B2 (en) * 2017-09-19 2022-08-09 日本電産リード株式会社 Contact terminal, inspection jig, and inspection device
JP7024275B2 (en) * 2017-09-19 2022-02-24 日本電産リード株式会社 Contact terminals, inspection jigs, and inspection equipment

Also Published As

Publication number Publication date
JPWO2022054802A1 (en) 2022-03-17
CN116057683A (en) 2023-05-02
KR20230065312A (en) 2023-05-11
WO2022054802A1 (en) 2022-03-17

Similar Documents

Publication Publication Date Title
JP4647139B2 (en) Contact structure
TWI821332B (en) Inspection jig, and inspection apparatus
KR102240208B1 (en) Inspection jig, and inspection device
JP5030060B2 (en) Electrical signal connection device
WO2008082815A2 (en) Resilient contact element and methods of fabrication
JP2010210600A (en) Probe card
JP7075725B2 (en) Electrical connection device
JP2005300545A (en) Electrical signal connection device, and probe assembly and prober device using it
JP7444077B2 (en) Contact terminals, inspection jigs, and inspection equipment
TW201839408A (en) Probe card for a testing apparatus of electronic devices
TWI400448B (en) Electrical signal connection device
JP2012127731A (en) Electrical connection device and method for manufacturing the same
TW202210838A (en) Contact terminal, inspection jig, inspection device, and manufacturing method
JP6393542B2 (en) Contact inspection device
JP7302011B2 (en) Probes on carrier structures for vertical probe arrays
TW201415040A (en) Method of manufacturing for electric inspection jig
JP3703794B2 (en) Probes and probe cards
JP5333829B2 (en) Probe assembly
JP2003121470A (en) Probe manufacturing method and probe
TWI776345B (en) Contactor, inspection jig, inspection device, and manufacturing method of contactor
TWI738201B (en) Probe card
JP7471778B2 (en) Probe Card
TW202109053A (en) Inspection jig and inspection device
JP2016148523A (en) Probe unit
CN113661565A (en) Inspection jig and inspection device