TW202201268A - Fingerprint collection module circuit, chip and electronic device - Google Patents
Fingerprint collection module circuit, chip and electronic device Download PDFInfo
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- TW202201268A TW202201268A TW110120103A TW110120103A TW202201268A TW 202201268 A TW202201268 A TW 202201268A TW 110120103 A TW110120103 A TW 110120103A TW 110120103 A TW110120103 A TW 110120103A TW 202201268 A TW202201268 A TW 202201268A
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- G06V40/10—Human or animal bodies, e.g. vehicle occupants or pedestrians; Body parts, e.g. hands
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Abstract
Description
本申請涉及無線通訊技術領域,尤其涉及一種指紋採集電路、晶片及具有指紋採集晶片的電子設備。The present application relates to the field of wireless communication technologies, and in particular, to a fingerprint collection circuit, a chip and an electronic device having a fingerprint collection chip.
先前的指紋採集電路架構複雜,採集指紋信號時易受外界信號干擾,影響感測的準確性。例如,指紋採集電路中採集指紋的金屬層與襯底層之間存在寄生電容,會影響指紋採集電路感測指紋信號的準確性。另外,現有指紋採集電路利用高增益放大器將指紋信號進行放大處理時,靈敏度也不高。The previous fingerprint acquisition circuit structure is complex, and the fingerprint signal is easily interfered by external signals, which affects the accuracy of sensing. For example, there is a parasitic capacitance between the metal layer and the substrate layer of the fingerprint collecting circuit in the fingerprint collecting circuit, which will affect the accuracy of the fingerprint signal sensing by the fingerprint collecting circuit. In addition, when the existing fingerprint acquisition circuit uses a high-gain amplifier to amplify the fingerprint signal, the sensitivity is not high.
有鑑於此,提供一種指紋採集電路及電子設備提高指紋信號的檢測準確度。In view of this, a fingerprint collection circuit and electronic device are provided to improve the detection accuracy of fingerprint signals.
本申請一實施方式中提供一種指紋採集電路,包括相互連接的圖元陣列感應電路及放大電路,圖元陣列感應電路包括多個圖元電路,每一圖元電路包括第一金屬層、第二金屬層、第三金屬層、襯底層,所述第一金屬層用於對手指指紋進行檢測,所述第二金屬層及所述第三金屬層設置於所述第一金屬層及所述襯底層之間,第二金屬層和第三金屬層在襯底層的投影覆蓋第一金屬層在襯底層的投影,從而將所述第一金屬層與所述襯底層進行隔離,所述第一金屬層被手指觸碰後生成指紋信號,放大電路用於對所述指紋信號進行放大。An embodiment of the present application provides a fingerprint acquisition circuit, which includes a graphic element array sensing circuit and an amplifying circuit that are connected to each other. The graphic element array sensing circuit includes a plurality of graphic element circuits, and each graphic element circuit includes a first metal layer, a second A metal layer, a third metal layer, and a substrate layer, the first metal layer is used for detecting fingerprints, and the second metal layer and the third metal layer are disposed on the first metal layer and the substrate Between the bottom layers, the projection of the second metal layer and the third metal layer on the substrate layer covers the projection of the first metal layer on the substrate layer, so as to isolate the first metal layer from the substrate layer. After the layer is touched by a finger, a fingerprint signal is generated, and the amplifying circuit is used for amplifying the fingerprint signal.
在本申請的一些實施例中,所述圖元陣列感應電路包括第一開關組、第二開關組,所述第一開關組包括第一子開關、第二子開關、第三子開關,所述第二開關組包括第一子開關、第二子開關、第三子開關,所述第一金屬層與所述第二金屬層連接,所述第二金屬層藉由所述第一開關組的第一子開關與電源電壓連接及藉由所述第二開關組的第一子開關與接地端連接,所述第一金屬層與所述第三金屬層連接,所述第三金屬層藉由所述第一開關組的第二子開關與所述電源電壓連接及藉由所述第二開關組的第二子開關與第一參考電壓連接,所述第一金屬層藉由所述第一開關組的第三子開關與電源電壓連接及藉由所述第二開關組的第三子開關與放大電路連接。In some embodiments of the present application, the picture element array sensing circuit includes a first switch group and a second switch group, and the first switch group includes a first sub-switch, a second sub-switch, and a third sub-switch, so The second switch group includes a first sub-switch, a second sub-switch, and a third sub-switch, the first metal layer is connected to the second metal layer, and the second metal layer is connected by the first switch group The first sub-switch is connected to the power supply voltage and is connected to the ground terminal through the first sub-switch of the second switch group, the first metal layer is connected to the third metal layer, and the third metal layer is The second sub-switch of the first switch group is connected to the power supply voltage and the second sub-switch of the second switch group is connected to the first reference voltage, and the first metal layer is connected to the first reference voltage through the second sub-switch of the second switch group. The third sub-switch of a switch group is connected to the power supply voltage and is connected to the amplifier circuit through the third sub-switch of the second switch group.
在本申請的一些實施例中,所述放大電路包括運算放大器及回饋環路,所述運算放大器包括同相輸入端、反向輸入端及輸出端,所述同相輸入端與所述第一參考電壓相連接,藉由調整所述第一參考電壓來調整所述輸出端的輸出電壓。In some embodiments of the present application, the amplifying circuit includes an operational amplifier and a feedback loop, the operational amplifier includes a non-inverting input terminal, an inverting input terminal and an output terminal, the non-inverting input terminal and the first reference voltage In connection, the output voltage of the output terminal is adjusted by adjusting the first reference voltage.
在本申請的一些實施例中,所述電阻藉由所述第二開關組的第二子開關與所述反向輸入端連接,所述輸出端藉由所述回饋環路與所述反向輸入端連接。In some embodiments of the present application, the resistor is connected to the inverting input terminal through the second sub-switch of the second switch group, and the output terminal is connected to the inverting terminal through the feedback loop. input connection.
在本申請的一些實施例中,所述回饋環路包括回饋電容、第三開關組及第四開關組,所述回饋電容的上極板藉由所述第三開關組的第一子開關與第二參考電壓連接,所述回饋電容的下極板藉由所述第三開關組的第二子開關與所述電源電壓連接,所述回饋電容的上極板藉由所述第四開關組的第一子開關與所述反向輸入端連接,所述回饋電容的下極板藉由所述第四開關組的第二子開關與所述輸出端連接,所述反向輸入端藉由所述第三開關組的第三子開關與所述輸出端連接。In some embodiments of the present application, the feedback loop includes a feedback capacitor, a third switch group and a fourth switch group, and the upper plate of the feedback capacitor is connected to the first sub-switch of the third switch group through the first sub-switch of the third switch group. The second reference voltage is connected, the lower plate of the feedback capacitor is connected to the power supply voltage through the second sub-switch of the third switch group, and the upper plate of the feedback capacitor is connected through the fourth switch group The first sub-switch is connected to the reverse input terminal, the lower plate of the feedback capacitor is connected to the output terminal through the second sub-switch of the fourth switch group, and the reverse input terminal is connected by The third sub-switch of the third switch group is connected to the output end.
在本申請的一些實施例中,所述指紋採集電路還包括數模轉換電路,所述數模轉換電路提供所述第一參考電壓及所述第二參考電壓。In some embodiments of the present application, the fingerprint collection circuit further includes a digital-to-analog conversion circuit, and the digital-to-analog conversion circuit provides the first reference voltage and the second reference voltage.
在本申請的一些實施例中,所述指紋採集電路提供第一時序控制信號、第二時序控制信號、第三時序控制信號及第四時序控制信號,所述第一時序控制信號與所述第二時序控制信號為相位相差180o 的時鐘信號,所述第三時序控制信號Φ1與所述第四時序控制信號Φ2是相位相差180o 的非交疊時鐘信號,所述第一時序控制信號用於控制所述第三開關組的第一子開關、第二子開關、第三子開關的開合與關閉,所述第二時序控制信號用於控制所述第四開關組的第一子開關、第二子開關的開合與關閉,所述第三時序控制信號用於控制所述第一開關組的第一子開關、第二子開關、第三子開關的開合與關閉,所述第四時序控制信號用於控制所述第二開關組的第一子開關、第二子開關、第三子開關的開合與關閉。In some embodiments of the present application, the fingerprint collection circuit provides a first timing control signal, a second timing control signal, a third timing control signal and a fourth timing control signal, the first timing control signal and the The second timing control signal is a clock signal with a phase difference of 180 ° , the third timing control signal Φ1 and the fourth timing control signal Φ2 are non-overlapping clock signals with a phase difference of 180 ° , and the first timing The control signal is used to control the opening and closing and closing of the first sub-switch, the second sub-switch and the third sub-switch of the third switch group, and the second timing control signal is used to control the first sub-switch of the fourth switch group. The opening and closing and closing of a sub-switch and the second sub-switch, the third timing control signal is used to control the opening and closing and closing of the first sub-switch, the second sub-switch and the third sub-switch of the first switch group , the fourth timing control signal is used to control the opening, closing and closing of the first sub-switch, the second sub-switch and the third sub-switch of the second switch group.
在本申請的一些實施例中,所述指紋採集電路工作步驟為:In some embodiments of the present application, the working steps of the fingerprint collection circuit are:
(a)起始階段;第一時序控制信號為高電平,第二時序控制信號為低電平,所述第三開關組的第一子開關、第二子開關、第三子開關同時導通,所述第四開關組的第一子開關、第二子開關同時斷開;(a) Initial stage; the first timing control signal is at a high level, the second timing control signal is at a low level, and the first sub-switch, the second sub-switch, and the third sub-switch of the third switch group are at the same time is turned on, the first sub-switch and the second sub-switch of the fourth switch group are simultaneously disconnected;
(b)掃描階段:所述第一時序控制信號為低電平,所述第二時序控制信號為高電平,所述第三開關組的第一子開關、第二子開關、第三子開關同時斷開,所述第四開關組的第一子開關、第二子開關同時導通;(b) Scanning stage: the first timing control signal is at a low level, the second timing control signal is at a high level, and the first sub-switch, the second sub-switch, and the third sub-switch of the third switch group The sub-switches are turned off at the same time, and the first sub-switch and the second sub-switch of the fourth switch group are turned on at the same time;
(c)預充電階段:第三時序控制信號為高電平,所述第一開關組的第一子開關、第二子開關、第三子開關同時導通,所述第四時序控制信號為低電平,所述第二開關組的第一子開關、第二子開關、第三子開關同時關閉;(c) Precharge stage: the third timing control signal is high, the first sub-switch, the second sub-switch, and the third sub-switch of the first switch group are turned on at the same time, and the fourth timing control signal is low level, the first sub-switch, the second sub-switch, and the third sub-switch of the second switch group are turned off simultaneously;
(d)電荷轉移階段,所述第三時序控制信號由高電平轉變為低電平,所述第一開關組的第一子開關、第二子開關、第三子開關同時斷開,所述第四時序控制信號由低電平轉變為高電平,所述第二開關組的第一子開關、第二子開關、第三子開關同時導通。(d) In the charge transfer stage, the third timing control signal changes from a high level to a low level, and the first sub-switch, the second sub-switch, and the third sub-switch of the first switch group are turned off at the same time, so the The fourth timing control signal changes from a low level to a high level, and the first sub-switch, the second sub-switch and the third sub-switch of the second switch group are turned on at the same time.
在本申請的一些實施例中,所述指紋採集電路還包括模數轉換電路,所述圖元陣列感應電路進行一次指紋採樣,所述模數轉換電路進行多次模數轉換;或所述圖元陣列感應電路進行多次採樣,所述模數轉換電路進行一次模數轉換;或所述圖元陣列感應電路進行多次採樣,所述模數轉換電路進行多次模數轉換。In some embodiments of the present application, the fingerprint acquisition circuit further includes an analog-to-digital conversion circuit, the primitive array sensing circuit performs one fingerprint sampling, and the analog-to-digital conversion circuit performs multiple analog-to-digital conversions; The element array sensing circuit performs multiple sampling, and the analog-to-digital conversion circuit performs one analog-to-digital conversion; or the image element array sensing circuit performs multiple sampling, and the analog-to-digital conversion circuit performs multiple analog-to-digital conversions.
本申請的實施例還提供一種指紋晶片,所述指紋晶片集成上述提供的指紋採集電路。Embodiments of the present application further provide a fingerprint chip, which integrates the fingerprint collection circuit provided above.
本申請的實施例還提供一種電子設備,所述電子設備採用上述提供的指紋晶片。The embodiment of the present application further provides an electronic device, and the electronic device adopts the fingerprint chip provided above.
本申請將第二金屬層及第三金屬層設置在第一金屬層及襯底層之間,以將第一金屬層與襯底層進行隔離,從而減少第一金屬層與襯底層的寄生電容的產生,提高了指紋信號的檢測準確度。In the present application, the second metal layer and the third metal layer are arranged between the first metal layer and the substrate layer to isolate the first metal layer from the substrate layer, thereby reducing the generation of parasitic capacitance between the first metal layer and the substrate layer , which improves the detection accuracy of fingerprint signals.
為了能夠更清楚地理解本申請實施例的上述目的、特徵和優點,下面結合附圖和具體實施方式對本申請進行詳細描述。需要說明的是,在不衝突的情況下,本申請的實施方式中的特徵可以相互組合。In order to more clearly understand the above objects, features and advantages of the embodiments of the present application, the present application will be described in detail below with reference to the accompanying drawings and specific embodiments. It should be noted that the features in the embodiments of the present application may be combined with each other unless there is conflict.
在下面的描述中闡述了很多具體細節以便於充分理解本申請實施例,所描述的實施方式是本申請一部分實施方式,而不是全部的實施方式。In the following description, many specific details are set forth in order to fully understand the embodiments of the present application, and the described embodiments are a part of the embodiments of the present application, but not all of the embodiments.
除非另有定義,本文所使用的所有的技術和科學術語與屬於本申請實施例的技術領域的技術人員通常理解的含義相同。在本申請的說明書中所使用的術語只是為了描述具體的實施方式的目的,不是旨在於限制本申請實施例。Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the technical field belonging to the embodiments of the present application. The terms used in the specification of the present application are only for the purpose of describing specific embodiments, and are not intended to limit the embodiments of the present application.
請參考圖1,所示為本申請一實施方式中指紋採集電路1的系統框體。本實施方式中,指紋採集電路1包括數模轉換電路11、圖元陣列感應電路12、放大電路13、緩衝器14及模數轉換電路15。數模轉換電路11與圖元陣列感應電路12相連接,用於為圖元陣列感應電路12提供參考電壓。本實施方式中,數模轉換電路11能夠為圖元陣圖元陣列感應電路12列感應電路12提供第一參考電壓VREF
及第二參考電壓VDC_OS
。圖元陣列感應電路12按照一定的時序控制進行掃描以檢測使用者的指紋信號。放大電路13與圖元陣列感應電路12相連接,用於對檢測出的指紋信號進行放大處理。緩衝器14與放大電路13相連接,用於對放大後的指紋信號進行暫存。模數轉換電路15與暫存器14連接,用於將放大後的指紋信號進行數模轉換並輸出。本實施方式中,由於數模轉換電路11、緩衝器14及模數轉換電路15為本領域現有的電路結構,且本申請並未對數模轉換電路11、緩衝器14及模數轉換電路15的電路結構進行改進。本申請對數模轉換電路11、緩衝器14及模數轉換電路15不作詳細介紹,如下僅對本申請的圖元陣列感應電路12及放大電路13的改進方案作具體描述。Please refer to FIG. 1 , which shows a system frame of a
本實施方式中,圖元陣列感應電路12包括m行n列的圖元電路121,其中,m,n為正整數。本實施方式中,由於圖元陣列感應電路12中每個圖元電路121的結構及工作原理相同,本申請只介紹單一圖元電路121的電路結構。請參考圖2,所示為本發明一實施方式中圖元電路121的電路結構圖。圖元電路121包括第一金屬層1211、第二金屬層1212、第三金屬層1213、襯底層1214。本實施方式中,第一金屬層1211用於對使用者的指紋進行檢測。當使用者的手指觸摸到第一金屬層1211時,由於人體本身是良導體,可以看作是接地端GND,使用者的手指與第一金屬層1211的有效接觸面積內形成第一寄生電容Cfinger
並將第一寄生電容Cfinger
信號作為檢測手指指紋的指紋信號。本實施方式中,手指指紋的紋穀和紋脊到第一金屬層1211的距離有差異,第一寄生電容Cfinger
的大小隨之產生差異,因此將第一寄生電容Cfinger
作為檢測手指指紋的指紋信號。本實施方式中,指紋信號為第一寄生電容Cfinger
的電荷量。In this embodiment, the picture element
手指觸摸第一金屬層1211後,第一金屬層1211與接地端GND產生Cfinger
,並且第一金屬層1211與襯底層1214之間還會形成第二寄生電容Cpex
,從而第一金屬層1211到襯底層(GND)的總寄生電容Ctop
=C1
+C2
,表示為其中C1
為第一寄生電容Cfinger
,C2
為第二寄生電容Cpex
。這樣從第一金屬層1211l感測到的電容不僅僅有第一寄生電容Cfinger
,還會有第二寄生電容Cpex
。而要提高指紋檢測精度會希望第一寄生電容Cfinger
無限接近於寄生總電容Ctop
,第二寄生電容Cpex
越接近於零越好。為了降低第二寄生電容Cpex
對指紋的檢測精度的影響,本申請在第一金屬層1211與襯底層1214之間設置第二金屬層1212及第三金屬層1213以將第一金屬層1211與襯底層1214進行隔離,第二金屬層1212和第三金屬層1213在襯底層1214的投影覆蓋第一金屬層1211在襯底層1214的投影,以消除第一金屬層1211與襯底層1214之間形成的第二寄生電容Cpex
,提高指紋信號的檢測準確度。具體地,第一金屬層1211與第二金屬層1212間隔設置,且第一金屬層1211與第二金屬層1212之間形成第一電容21。第一金屬層1211與第三金屬層1213間隔設置,且第一金屬層1211與第三金屬層1213之間形成第二電容22。After the finger touches the
請參考圖3,為本申請一實施方式中圖元陣列感應電路12與放大電路13的具體連接示意圖。本實施方式中,第一金屬層1211與視為GND的人體形成第一寄生電容Cfinger
。第一電容21為第一金屬層1211與第二金屬層1212之間形成的寄生電容。圖元陣列感應電路12包括第一開關組、第二開關組及電阻1218。第一開關組包括第一子開關Φ11、第二子開關Φ12、第三子開關Φ13。第二開關組包括第一子開關Φ21、第二子開關Φ22、第三子開關Φ23。Please refer to FIG. 3 , which is a schematic diagram of a specific connection between the pixel
第一金屬層1211與第二金屬層1212連接(電氣連接)並形成第一電容21。第二金屬層1212藉由第一開關組的第一子開關Φ11與電源電壓VDD
連接,第二金屬層1212藉由第二開關組的第一子開關Φ21與接地端GND連接。The
第一金屬層與第三金屬層1213連接(電氣連接)並形成第二電容22。第三金屬層1213藉由第一開關組的第二子開關Φ12與電源電壓VDD
連接,藉由第二開關組的第二子開關Φ22與第一參考電壓VREF
連接。The first metal layer is connected (electrically connected) to the
第一金屬層1211第一開關組的第三子開關Φ13與電源電壓VDD
連接及藉由所述第二開關組的第三子開關Φ23與放大電路連接13連接。具體地,第一金屬層1211與電阻1218的一端連接。電阻1218的另一端藉由第一開關組的第三子開關Φ13與電源電壓VDD
連接,及藉由第二開關組的第二子開關Φ23與放大電路13連接。The third sub-switch Φ13 of the first switch group of the
本實施方式中,放大電路13用於對指紋採集電路1檢測到的指紋信號進行放大。本實施方式中,放大電路13包括運算放大器131及回饋環路132。運算放大器131包括同相輸入端1311、反向輸入端1312及輸出端1313。同相輸入端1311與第一參考電壓VREF
相連接。電阻1218藉由第二開關組的第二子開關Φ23與反向輸入端1312連接。輸出端1313藉由回饋環路132與反向輸入端1312連接。In this embodiment, the amplifying
本實施方式中給,回饋環路132包括回饋電容CFB
、第三開關組及第四開關組。第三開關組包括第一子開關rst_a1、第二子開關rst_a2、第三子開關rst_a3。第四開關組包括第一子開關rst_b1、第二子開關rst_b2。回饋電容CFB
的上極板藉由第三開關組的第一子開關rst_a1與第二參考電壓VDC_OS
連接。回饋電容CFB
的下極板藉由第三開關組的第二子開關rst_a2與電源電壓VDD
連接。回饋電容CFB
的上極板藉由第四開關組的第一子開關rst_b1與反向輸入端1312連接。回饋電容CFB
的下極板藉由第四開關組的第二子開關rst_b2與輸出端連接1313。反向輸入端1312還藉由第三開關組的第三子開關rst_a3與輸出端1313連接。In this embodiment, the
請參考圖4,為本申請一實施方式中指紋採集電路1進行指紋採集的時序圖。指紋採集電路1提供第一時序控制信號reset_a、第二時序控制信號reset_b、第三時序控制信號Φ1及第四時序控制信號Φ2。第一時序控制信號reset_a與第二時序控制信號reset_b是相位相差180o
的時鐘信號。第三時序控制信號Φ1與第四時序控制信號Φ2是相位相差180o
的非交疊時鐘信號。Please refer to FIG. 4 , which is a sequence diagram of fingerprint collection performed by the
第一時序控制信號reset_a用於控制第三開關組的第一子開關rst_a1、第二子開關rst_a2、第三子開關rst_a3的開合與關閉。第三開關組的第一子開關rst_a1、第二子開關rst_a2、第三子開關rst_a3的開合與關閉的時序完全相同。第二時序控制信號reset_b用於控制第四開關組的第一子開關rst_b1、第二子開關rst_b2的開合與關閉。第四開關組的第一子開關rst_b1、第二子開關rst_b2的開合與關閉的時序完全相同。第三時序控制信號Φ1用於控制第一開關組的第一子開關Φ11、第二子開關Φ12、第三子開關Φ13的開合與關閉。第一開關組的第一子開關Φ11、第二子開關Φ12、第三子開關Φ13的開合與關閉的時序相同。第四時序控制信號Φ2用於控制第二開關組的第一子開關Φ21、第二子開關Φ22、第三子開關Φ23的開合與關閉。第二開關組的第一子開關Φ21、第二子開關Φ22、第三子開關Φ23的開合與關閉的時序相同。The first timing control signal reset_a is used to control the opening, closing and closing of the first sub-switch rst_a1 , the second sub-switch rst_a2 and the third sub-switch rst_a3 of the third switch group. The timings of opening, closing and closing of the first sub-switch rst_a1 , the second sub-switch rst_a2 , and the third sub-switch rst_a3 of the third switch group are exactly the same. The second timing control signal reset_b is used to control the opening and closing and closing of the first sub-switch rst_b1 and the second sub-switch rst_b2 of the fourth switch group. The timings of switching on and off of the first sub-switch rst_b1 and the second sub-switch rst_b2 of the fourth switch group are exactly the same. The third timing control signal Φ1 is used to control the opening, closing and closing of the first sub-switch Φ11 , the second sub-switch Φ12 , and the third sub-switch Φ13 of the first switch group. The opening, closing and closing timings of the first sub-switch Φ11 , the second sub-switch Φ12 , and the third sub-switch Φ13 of the first switch group are the same. The fourth timing control signal Φ2 is used to control the opening, closing and closing of the first sub-switch Φ21 , the second sub-switch Φ22 , and the third sub-switch Φ23 of the second switch group. The first sub-switch Φ21 , the second sub-switch Φ22 , and the third sub-switch Φ23 of the second switch group are turned on and off at the same timing.
下面結合圖4及圖3具體描述本申請的指紋採集電路1的工作過程。該工作過程包括以下幾個階段。The working process of the
a)起始階段, 第一時序控制信號reset_a為高電平,第二時序控制信號reset_b為低電平,此時第三開關組的第一子開關rst_a1、第二子開關rst_a2、第三子開關rst_a3同時導通,第四開關組的第一子開關rst_b1、第二子開關rst_b2同時斷開。運算放大器的輸出端1313連接反相輸入端1312,運算放大器131為緩衝器(buffer)結構,Vn=VREF。回饋電容CFB
的上極板連接第二參考電壓VDC_OS
,下極板接電源電壓VDD
,回饋電容CFB
電壓根據公式計算得到,其中,VCFB1
表示回饋電容CFB
兩端電壓。回饋電容CFB
的電荷根據公式計算得到,其中,CFB
為回饋電容CFB
的電容量,QCFB1
為回饋電容CFB
的電荷量,VDC_OS
為第二參考電壓。a) In the initial stage, the first timing control signal reset_a is at a high level, and the second timing control signal reset_b is at a low level. At this time, the first sub-switch rst_a1, the second sub-switch rst_a2, the third sub-switch rst_a1, and the third sub-switch rst_a2 of the third switch group The sub-switches rst_a3 are turned on at the same time, and the first sub-switch rst_b1 and the second sub-switch rst_b2 of the fourth switch group are turned off at the same time. The
b)掃描階段,第一時序控制信號reset_a為低電平,第二時序控制信號reset_b為高電平,此時第三開關組的第一子開關rst_a1、第二子開關rst_a2、第三子開關rst_a3同時斷開,第四開關組的第一子開關rst_b1、第二子開關rst_b2同時導通。回饋電容CFB
的上極板連接運算放大器131的反向輸入端1312,下極板連接運算放大器131的輸出端1313。回饋電容CFB
的電壓根據公式計算得到,其中,VOUT
為表示運算放大器131的輸出端1313的輸出電壓,VREF
為第一參考電壓。回饋電容CFB
的電荷根據公式計算得到。b) In the scanning phase, the first timing control signal reset_a is at a low level, and the second timing control signal reset_b is at a high level. At this time, the first sub-switch rst_a1, the second sub-switch rst_a2, the third sub-switch rst_a2 and the third sub-switch of the third switch group The switches rst_a3 are turned off at the same time, and the first sub-switch rst_b1 and the second sub-switch rst_b2 of the fourth switch group are turned on at the same time. The upper plate of the feedback capacitor C FB is connected to the inverting
由於回饋電容CFB
的電荷在起始階段及掃描階段沒有變化,所以運算放大器131的輸出端1313的輸出電壓根據公式計算得到。根據電荷守恆定律,回饋電容CFB
的電荷根據公式:計算得到。Since the charge of the feedback capacitor C FB does not change in the initial stage and the scanning stage, the output voltage of the
(c)預充電階段,第三時序控制信號Φ1為高電平,第一開關組的第一子開關Φ11、第二子開關Φ12、第三子開關Φ13同時導通。第四時序控制信號Φ2為低電平,第二開關組的第一子開關Φ21、第二子開關Φ22、第三子開關Φ23同時斷開,第一電容21、第二電容22、第一寄生電容Cfinger
連接電源電壓VDD
,第一金屬層1211與運算放大器131斷開,第一金屬層1211的電荷藉由公式計算得到,其中,Cfinger
為第一寄生電容Cfinger
的電容,Q1為第一金屬層1211的電荷。(c) In the precharging stage, the third timing control signal Φ1 is at a high level, and the first sub-switch Φ11 , the second sub-switch Φ12 , and the third sub-switch Φ13 of the first switch group are turned on at the same time. The fourth timing control signal Φ2 is at a low level, the first sub-switch Φ21, the second sub-switch Φ22, and the third sub-switch Φ23 of the second switch group are turned off at the same time, the
(d)電荷轉移階段,第三時序控制信號Φ1由高電平轉變為低電平,第一開關組的第一子開關Φ11、第二子開關Φ12、第三子開關Φ13同時斷開。第四時序控制信號Φ2由低電平轉變為高電平,第二開關組的第一子開關Φ21、第二子開關Φ22、第三子開關Φ23同時導通。 第三子開關Φ23導通時,運算放大器131的反相輸入端1312藉由第三子開關Φ23連接至第一金屬層1211,運算放大器131的輸出端1313和反相輸入端1312藉由回饋電容CFB
連接,構成回饋結構。運算放大器131的反相輸入端1312的電壓等於正相輸入端電壓1311,即第一金屬層1211的電壓為第一參考電壓VREF
。第二子開關Φ22由斷開轉為導通狀態,第三金屬層1213的電壓為第一參考電壓VREF
,因為第一金屬層1211和第三金屬層1213的電壓均為VREF ,
第一金屬層1211和第三金屬層1213構成的第二電容22沒有電荷轉移。第二開關組的第一子開關Φ21由斷開轉為導通狀態,第二金屬層1212連接接地端GND,第一金屬層1211到接地端GND的總寄生電容為,其中C2
為第一電容21的電容。總寄生電容的電荷量根據公式計算得到。第三子開關Φ23導通之前,運算放大器131的反相輸入端1312的電荷量根據公式計算得到。第三子開關Φ23導通後,總寄生電容的電荷量。根據電荷守恆定律,,則計算得到運算放大器131的輸出端1313的輸出電壓。(d) In the charge transfer stage, the third timing control signal Φ1 changes from a high level to a low level, and the first sub-switch Φ11 , the second sub-switch Φ12 , and the third sub-switch Φ13 of the first switch group are turned off at the same time. The fourth timing control signal Φ2 changes from a low level to a high level, and the first sub-switch Φ21 , the second sub-switch Φ22 , and the third sub-switch Φ23 of the second switch group are turned on at the same time. When the third sub-switch Φ23 is turned on, the inverting
經過N次積分,指紋信號量得到放大,有效地提高信號採集的靈敏度。運算放大器131的輸出端1313的輸出電壓為:
本實施方式中,圖元陣列感應電路12在空掃時,需要保持VOUT
不隨積分次數N的變化而變化,輸出端1313的輸出電壓則為固定值,與第一寄生電容Cfinger
無關。After N times of integration, the amount of fingerprint signal is amplified, which effectively improves the sensitivity of signal acquisition. The output voltage of the
假設空掃時運算放大器131的輸出端1313的輸出電壓
若空掃時的VOUT
低於VOUT
_VIR
,則說明VREF
項(正數項)小於VDD
項(負數項),需將VREF
增大。若空掃時的VOUT
高於Vout_vir,則說明VREF
項(正數項)大於VDD
項(負數項),需將VREF
減小。因此,本實施方式中,可以藉由調整第一參考電壓VREF
及第二參考電壓VDC_OS
來調整輸出端1313的輸出電壓VOUT
,防止指紋信號Cfinger
過小,後端的模數轉換電路15無法處理的問題。第一參考電壓VREF
可調節,適應不同的應用場景,提高了應用的靈活性。Assume that the output voltage of the
本實施例中的整個圖元陣列感應電路12和放大電路13結構簡單,所需的電源電壓VDD
和地GND都無需特別處理,且相容晶片的其他模組的VDD
和GND,無需採用特殊製程,藉由普通CMOS製程均可實現。The entire picture element
本實施例中感測的指紋信號的靈敏度高,而不需要藉由提高圖元陣列感應電路的面積來提高靈敏度,對比一般的採集電路,本實施例中的圖元陣列感應電路面積可縮小,節約晶片成本。The sensitivity of the fingerprint signal sensed in this embodiment is high, and it is not necessary to increase the sensitivity by increasing the area of the sensing circuit of the image element array. Compared with the general acquisition circuit, the area of the sensing circuit of the image element array in this embodiment can be reduced. Save wafer cost.
其它實施方式中,本申請中的放大器131的回饋電容CFB
可適用不同外界條件的應用情況進行多樣化設置。In other embodiments, the feedback capacitor C FB of the
其它實施方式中,指紋採集電路1的圖元陣列感應電路12進行一次指紋採樣後,所述模數轉換電路15進行多次模數轉換;或圖元陣列感應電路12進行多次指紋採樣後,模數轉換電路15進行一次模數轉換;亦或圖元陣列感應電路12進行多次指紋採樣後,模數轉換電路15進行多次模數轉換等不同的工作模式,以有效提升指紋的信號量。In other embodiments, after the graphic element
本申請的實施例還提供了一種指紋晶片,指紋晶片包括指紋採集電路1。指紋採集電路1如上述實施方式中提供。關於指紋採集電路的具體內容,可以參見上述實施方式中的內容,此處不再贅述。The embodiment of the present application also provides a fingerprint chip, and the fingerprint chip includes a
本申請的實施例還提供了一種電子設備,電子設備包括上述實施方式中提供的指紋晶片。The embodiments of the present application also provide an electronic device, the electronic device includes the fingerprint chip provided in the foregoing embodiments.
綜上所述,本發明符合發明專利要件,爰依法提出專利申請。惟,以上所述僅為本發明之較佳實施方式,舉凡熟悉本案技藝之人士,在援依本案創作精神所作之等效修飾或變化,皆應包含於以下之申請專利範圍內。To sum up, the present invention complies with the requirements of an invention patent, and a patent application can be filed in accordance with the law. However, the above descriptions are only the preferred embodiments of the present invention, and for those who are familiar with the techniques of this case, equivalent modifications or changes made in accordance with the creative spirit of this case shall be included in the scope of the following patent application.
1:指紋採集電路 11:數模轉換電路 12:圖元陣列感應電路 13:放大電路 14:緩衝器 15:模數轉換電路 VREF :第一參考電壓 VDC_OS :第二參考電壓 121:圖元電路 1211:第一金屬層 1212:第二金屬層 1213:第三金屬層 1214:襯底層 GND:接地端 Cfinger :第一寄生電容 Cpex :第二寄生電容 1218:電阻 Φ11:第一子開關 Φ12:第二子開關 Φ13:第三子開關 Φ21:第一子開關 Φ22:第二子開關 Φ23:第三子開關 22:第二電容 VDD :電源電壓 131:運算放大器 132:回饋環路 1311:同相輸入端 1312:反向輸入端 1313:輸出端 VREF :第一參考電壓 CFB :回饋電容 rst_a1:第一子開關 rst_a2:第二子開關 rst_a3:第三子開關 rst_b1:第一子開關 rst_b2:第二子開關 VDC_OS :第二參考電壓 reset_a:第一時序控制信號 reset_b:第二時序控制信號 Φ1:第三時序控制信號 Φ2:第四時序控制信號1: fingerprint acquisition circuit 11: digital-to-analog conversion circuit 12: primitive array sensing circuit 13: amplifier circuit 14: buffer 15: analog-to-digital conversion circuit V REF : first reference voltage V DC_OS : second reference voltage 121 : primitive Circuit 1211: first metal layer 1212: second metal layer 1213: third metal layer 1214: substrate layer GND: ground terminal C finger : first parasitic capacitance C pex : second parasitic capacitance 1218: resistance Φ11: first sub-switch Φ12: second sub-switch Φ13: third sub-switch Φ21: first sub-switch Φ22: second sub-switch Φ23: third sub-switch 22: second capacitor V DD : power supply voltage 131: operational amplifier 132: feedback loop 1311 : non-inverting input terminal 1312 : reverse input terminal 1313 : output terminal V REF : first reference voltage C FB : feedback capacitor rst_a1 : first sub-switch rst_a2 : second sub-switch rst_a3 : third sub-switch rst_b1 : first sub-switch rst_b2: second sub-switch V DC_OS : second reference voltage reset_a: first timing control signal reset_b: second timing control signal Φ1: third timing control signal Φ2: fourth timing control signal
圖1為本申請一實施方式中指紋採集電路的系統框體。FIG. 1 is a system frame of a fingerprint collection circuit in an embodiment of the present application.
圖2為本發明一實施方式中圖元電路的電路結構圖。FIG. 2 is a circuit structure diagram of a primitive circuit in an embodiment of the present invention.
圖3為本申請一實施方式中圖元陣列感應電路與放大電路的具體連接示意圖。FIG. 3 is a schematic diagram of a specific connection between the sensing circuit of the primitive array and the amplifying circuit in an embodiment of the present application.
圖4為本申請一實施方式中指紋採集電路進行指紋採集的時序圖。FIG. 4 is a sequence diagram of fingerprint collection performed by a fingerprint collection circuit according to an embodiment of the present application.
1:指紋採集電路 1: Fingerprint acquisition circuit
11:數模轉換電路 11: Digital-to-analog conversion circuit
12:圖元陣列感應電路 12: Element Array Induction Circuit
13:放大電路 13: Amplifier circuit
14:緩衝器 14: Buffer
15:模數轉換電路 15: Analog-to-digital conversion circuit
Claims (11)
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CN104748770B (en) * | 2013-12-27 | 2017-04-12 | 比亚迪股份有限公司 | Capacitance detection device used for fingerprint identification and fingerprint identification device provided with same |
WO2015135578A1 (en) * | 2014-03-12 | 2015-09-17 | Idex Asa | Fingerprint detecting apparatus and driving method thereof |
CN105740756A (en) * | 2014-12-26 | 2016-07-06 | 义隆电子股份有限公司 | Fingerprint Sensing Device And Fingerprint Sensing Method Thereof |
CN106951818B (en) * | 2016-01-07 | 2020-06-05 | 旭景科技有限公司 | Capacitive fingerprint sensing unit, enhanced capacitive fingerprint reader and sensing method |
US9767339B1 (en) * | 2016-03-18 | 2017-09-19 | Himax Technologies Limited | Fingerprint identification device |
CN105913048B (en) * | 2016-03-25 | 2019-08-20 | 深圳市奔凯安全技术股份有限公司 | A kind of finger prints processing device |
KR102009260B1 (en) * | 2016-08-24 | 2019-08-09 | 선전 구딕스 테크놀로지 컴퍼니, 리미티드 | Capacitive Decision Circuit and Fingerprint Identification System |
KR102028267B1 (en) * | 2016-10-27 | 2019-10-02 | 선전 구딕스 테크놀로지 컴퍼니, 리미티드 | Capacitive fingerprint sensor |
CN110096931B (en) * | 2018-01-31 | 2023-07-04 | 敦泰电子有限公司 | Sensor unit, fingerprint identification method, fingerprint identification chip and electronic equipment |
CN108345870B (en) * | 2018-03-15 | 2022-08-05 | 重庆纳尔利科技有限公司 | High-precision fingerprint sensor capable of preventing influence of parasitic capacitance |
CN110175492B (en) * | 2018-07-20 | 2022-03-01 | 神盾股份有限公司 | Optical fingerprint sensing device |
KR20200085403A (en) * | 2019-01-04 | 2020-07-15 | 삼성디스플레이 주식회사 | Fingerprint sensor and display device including the same |
WO2020199155A1 (en) * | 2019-04-03 | 2020-10-08 | 深圳市汇顶科技股份有限公司 | Thin film semiconductor structure and related operation method, and handheld apparatus having fingerprint sensing function |
CN110210349B (en) * | 2019-05-22 | 2021-05-11 | 上海思立微电子科技有限公司 | Fingerprint sensor and mobile terminal |
CN210142327U (en) * | 2019-06-04 | 2020-03-13 | 苏州市乙木电子科技有限公司 | High-sensitivity capacitance sensor circuit |
CN210109835U (en) * | 2019-08-08 | 2020-02-21 | 上海思立微电子科技有限公司 | Fingerprint sensing system |
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