TW202129263A - Inspection method, inspection apparatus and inspection system - Google Patents

Abstract

An object of the present invention is to provide an inspection method which is capable of suppressing the influence of in-plane phase difference in a base film, and meanwhile conducting inspection of defects of a phase difference film comprising a cured article of a polymerizable liquid crystal compound. The inspection method makes light incident to an object to be inspected 10 so as to determine whether a phase difference film has a defect or not, the object to be inspected 10 comprising: a base film 8A having an in-plane phase difference value larger than 50 nm at wavelength of 550 nm, and the phase difference film 7A having a cured article of a polymerizable liquid crystal compound formed on one side of the base film. A first linear polarizing plate 3, the object to be inspected 10, a phase difference filter 4 and a second linear polarizing plate 5 are arranged in this order. The slow axis of the base film and the slow axis of the first or second linear polarizing plate are approximately orthogonal or parallel to each other. The slow axes of the phase difference film and the phase difference filter are approximately orthogonal to each other, and the in-plane phase differences of the phase difference film and the phase difference filter are approximately the same as each other. The inspection method makes light incident to one of the first linear polarizing plate side and second linear polarizing plate side, and observes the light from the other.

Description

Inspection method, inspection device and inspection system

The present invention relates to an inspection method, inspection device and inspection system.

The retardation film system can convert linear polarization into circular polarization or elliptical polarization, or vice versa, convert circular polarization or elliptic polarization into linear polarization, so the phase difference film and linear polarization plate are combined to form (elliptical) circular polarization plate application Used in organic EL (Electroluminescence) display devices or reflective liquid crystal display devices. Among the retardation films, the retardation film obtained by aligning and curing a polymerizable liquid crystal compound is an extremely thin film, and therefore attracts attention in manufacturing thin display devices (for example, refer to Patent Document 1).

With regard to the method of manufacturing such retardation film, usually, a liquid composition containing a polymerizable liquid crystal compound is coated on a long substrate film to form a film, and the polymerizability of the film is After the liquid crystal compound is aligned in a desired direction, active energy rays are irradiated. Thereby, the polymerizable liquid crystal compound after alignment is cured to become a retardation film. In addition, when aligning the polymerizable liquid crystal compound, there are cases where an alignment film is formed on the base film before the liquid composition is applied to the base film.

[Prior Technical Literature]

[Patent Literature]

Patent Document 1: Japanese Patent Application Publication No. 2006-58546

In this manufacturing method, when dust or the like is present on the base film or the alignment film, the alignment of the polymerizable liquid crystal compound may be disordered in the dust portion, which may cause defects. Furthermore, when the base film has an in-plane retardation, it is easy to make it difficult to optically inspect the retardation film formed on the base film for defects. Since base films available on the market at low prices are generally manufactured in a stretched manner, it is difficult to use inexpensive base films for inspections of retardation films manufactured by the above-mentioned methods.

Therefore, the object of the present invention is to provide an inspection method, inspection device, and inspection that suppresses the influence of the in-plane retardation of the base film while inspecting the retardation film composed of the cured product of the polymerizable liquid crystal compound for defects system.

The present invention provides an inspection method. The inspection method is to inject light into a film-like inspection object to determine whether the retardation film is defective, and the film-like inspection object has an in-plane retardation value at a wavelength of 550nm It is a base film of 50 nm or more, and a retardation film composed of a cured product of a polymerizable liquid crystal compound formed on one side of the base film; wherein, the first linear polarizing plate, the inspection object, and the retardation filter ( filter), the second linear polarizing plate is arranged in sequence, the substrate film side of the inspected object is facing the first linear polarizing plate side, and the slow axis of the substrate film is connected to the first linear polarizing plate or the second linear polarizing plate. The polarization axes of the plates are approximately orthogonal or approximately parallel to each other, the slow axis of the retardation film and the retardation axis of the retardation filter The in-plane retardation value of the retardation film at a wavelength of 550nm and the in-plane retardation value of the retardation filter at a wavelength of 550nm are approximately the same. The first linear polarizing plate and the second linear The polarizing plate constitutes a crossed nicol. From either the first linear polarizing plate side or the second linear polarizing plate side, the light is incident in such a way that the optical axis passes through a predetermined inspection area on the object to be inspected. And the second linear polarizing plate or the first linear polarizing plate is observed from the side of the first linear polarizing plate or the other side of the second linear polarizing plate side.

In this inspection method, the polarization axes of the first linear polarizing plate or the second linear polarizing plate are arranged to be approximately orthogonal or approximately parallel to each other with respect to the slow axis of the base film with phase difference. Therefore, after passing through the linear polarizing plate The polarization state of the light will not be disturbed by the base film.

That is, the composed optical system functions as expected, and when a defect occurs in the retardation film, the defect can be appropriately recognized in the observation field of view. Therefore, according to this inspection method, the influence of the in-plane retardation of the base film can be suppressed, and it is easy to judge whether the retardation film has defects.

In addition, in this inspection method, the first linear polarizing plate and the second linear polarizing plate constitute an orthogonal polarizer. At this time, the entire observation field can be made the darkest, so the defect part of the retardation film observed as a bright spot is the most prominent in the observation field. Therefore, the presence or absence of defects in the retardation film can be judged more easily.

In this inspection method, it is also possible to have a step of obtaining the direction of the retardation axis of the base film in advance by using an orientation angle measuring device for the base film before forming the retardation film. When the direction of the slow axis of the base film is not clear, by calculating the direction of the slow axis of the base film in advance, the polarization axis of the first linear polarizing plate or the second linear polarizing plate can be arranged with the base material The slow axis of the film is approximately orthogonal or approximately parallel to each other.

Furthermore, at this time, it is also possible to have: after obtaining the slow axis of the base film by an orientation angle measuring device, a liquid composition containing a polymerizable liquid crystal compound is applied to one side of the base film to remove The step of forming a coating film containing a polymerizable liquid crystal compound on the surface of a base film, and aligning and curing the polymerizable liquid crystal compound contained in the coating film to form a retardation film. Thereby, the production efficiency of the retardation film is improved.

In addition, in the inspection method of the present invention, the inspection object may be conveyed in the longitudinal direction of the inspection object between the first linear polarizing plate and the retardation filter, and the inspection may be continuously performed in the longitudinal direction. In this way, the inspection efficiency of the inspection object can be improved.

In addition, in the inspection method of the present invention, a plurality of detection areas may be provided in the width direction of the inspection object. Since the base film is generally manufactured by stretching in at least one direction, the direction of the slow axis is usually different in the width direction. Therefore, by dividing the inspection area in the entire width direction of the inspection object and performing the inspection in each inspection area, it is possible to perform an inspection that suppresses the influence of the in-plane retardation of the base film at each part in the width direction.

In addition, the present invention provides an inspection device that injects light into a film-like inspection object to determine whether the retardation film is defective, and the film-like inspection object has an in-plane phase at a wavelength of 550 nm. A base film with a difference of 50 nm or more, and a retardation film formed on one side of the base film made of a cured product of a polymerizable liquid crystal compound; the inspection device includes: a first linear polarizing plate and a retardation filter , Is arranged across the place where the inspected object is arranged; the second linear polarizer is arranged in the area on the opposite side of the place where the inspected object is arranged in terms of the phase difference filter; and the light source is arranged on the first The linear polarizing plate or the second linear polarizing plate is arranged in the area on the opposite side to the place where the inspection object is arranged; the first linear polarizing plate or the second linear polarizing plate is arranged so that the polarization axis and the base film are delayed The axes are approximately orthogonal or approximately parallel to each other. The first linear polarizer and the second linear polarizer constitute an orthogonal polarizer, and the retardation filter system is arranged so that its late axis and the retardation axis of the retardation film are approximately positive to each other pay, The in-plane retardation of the retardation filter at a wavelength of 550nm is set to be approximately the same as the in-plane retardation value of the retardation film at a wavelength of 550nm, and the light source is configured such that the first linearly polarized light is arranged on the optical axis On the board, the predetermined detection area on the inspected object, the phase difference filter, and the position of the second linear polarizing plate.

In this inspection device, the polarization axes of the first linear polarizer or the second linear polarizer are arranged to be substantially orthogonal or substantially parallel to each other with respect to the slow axis of the substrate film with phase difference. Therefore, after passing through the linear polarizer The polarization state of the light will not be disturbed by the base film. That is, the composed optical system functions as expected, and when a defect occurs in the retardation film, the defect can be appropriately recognized in the observation field of view. Therefore, according to this inspection device, the influence of the in-plane retardation of the base film can be suppressed, and at the same time, it is easy to determine whether the retardation film is defective.

In addition, in this inspection device, the first linear polarizing plate and the second linear polarizing plate constitute an orthogonal polarizer. At this time, the entire observation field can be made the darkest, so the defect part of the retardation film that is observed as a bright spot will be the most prominent in the observation field. Therefore, the presence or absence of defects in the retardation film can be judged more easily.

In addition, the present invention provides an inspection system including: the above-mentioned inspection device; an alignment angle measuring device for obtaining the slow axis of the substrate film before the retardation film is formed; and an angle adjustment mechanism for adjusting The angle of the first linear polarizer is such that the slow axis of the base film obtained by the alignment angle measuring device and the polarization axis of the first linear polarizer become approximately orthogonal or approximately parallel to each other. When the direction of the slow axis of the base film is not clear, by calculating the direction of the slow axis of the base film in advance, the polarization axis of the first linear polarizing plate or the second linear polarizing plate can be arranged with the base material The slow axis of the film is approximately orthogonal or approximately parallel to each other. In addition, by having an angle adjustment mechanism, the angle adjustment of the inspection system can be automated.

According to the present invention, it is possible to provide an inspection method, inspection device and inspection system, which can suppress the influence of the in-plane retardation of the substrate film and at the same time inspect the retardation film composed of the cured product of the polymerizable liquid crystal compound Whether there are defects.

1A, 1B: inspection device

2: light source

3: The first linear polarizer

4: Phase difference filter

5: The second linear polarizer

6: Camera (detection means)

7A, 7B: retardation film

7a: Coating film

8A, 8B: base film

9: Optical axis

10: Object to be inspected

12: Orientation angle measurer

14: Angle adjustment mechanism

16: Coating machine

18: Dryer

100: Check the system

A: Detection area

FIG. 1 is a diagram showing the inspection device of the first embodiment.

Fig. 2 is a diagram showing the inspection system of the first embodiment.

3 is a partial perspective view showing the configuration of a plurality of inspection devices in the inspection system of the first embodiment.

Fig. 4 is a top view showing the state of the slow axis of the base film.

Fig. 5 is a diagram showing the inspection device of the second embodiment.

The preferred embodiments of the present invention will be described in detail below with reference to the drawings. In addition, the same symbols are attached to the same parts or equivalent parts in each figure, and repeated descriptions are omitted.

(Definition of terms and signs)

The definitions of terms and symbols in this specification are as follows.

(1) Refractive index (nx, ny, nz)

"Nx" is the refractive index in the direction in which the in-plane refractive index becomes the largest (that is, the slow axis direction), "ny" is in the direction orthogonal to the slow axis in the plane, and "nz" is the refractive index in the thickness direction .

(2) In-plane phase difference value

The in-plane retardation value (Re(λ)) refers to the in-plane retardation value of the film at 23°C and wavelength λ (nm). When the thickness of the Re(λ)-based film is d (nm), it is obtained by Re(λ)=(nx-ny)×d.

(3) Retardation value in the thickness direction

The thickness direction retardation value (Rth(λ)) refers to the thickness direction retardation value of the film at 23°C and wavelength λ (nm). When the thickness of the Rth(λ)-based film is d (nm), it is calculated by Rth(λ)=((nx+ny)/2-nz)×d.

<First Implementation Type>

(Inspection device and inspected object)

The inspection device of this embodiment is to inspect the retardation film for optical defects. As shown in FIG. 1, the inspection apparatus 1A is composed of a light source 2, a first linear polarizing plate 3, a phase difference filter 4, a second linear polarizing plate 5, and a camera (detection means) 6 are arranged in this order. The inspection apparatus 1A is provided with a place where the inspection object 10 belonging to the inspection object is arranged between the first linear polarizing plate 3 and the retardation filter 4. In FIG. 1, the inspection object 10 is depicted in this place. Situation.

First, the film-shaped inspection object 10 belonging to the inspection target will be described. The inspection object 10 includes a retardation film 7A belonging to the main body of the inspection target, and a base film 8A having a retardation film 7A in a single-area layer. As an example of the retardation film 7A, it is used in a display device such as a liquid crystal display device or an organic EL display device as a circular polarizing plate in combination with a linear polarizing plate. In addition, the "circular polarizing plate" in this specification includes a circular polarizing plate and an elliptical polarizing plate. In addition, "circularly polarized light" includes circularly polarized light and elliptical polarized light.

An example of the retardation film 7A is a film that converts linearly polarized light into circularly polarized light. For example, the retardation film 7A is a λ/4 plate. In this embodiment, the retardation film 7A is cured by a polymerizable liquid crystal compound Constituted by things. The retardation film 7A composed of a cured product of a polymerizable liquid crystal compound is usually as thin as about 0.2 μm to 10 μm in thickness, and when foreign matter or the like is contained, the retardation value tends to decrease in this part.

Examples of polymerizable liquid crystal compounds that can be used to form the retardation film 7A include Japanese Patent Application Publication No. 2009-173893, Japanese Patent Application Publication No. 2010-31223, WO2012/147904, WO2014/10325, and WO2017-43438 No. Bulletin. The polymerizable liquid crystal compound systems described in these publications can form a retardation film having so-called reverse wavelength dispersion, which can allow uniform polarization conversion in a wide wavelength range.

As a method of forming the retardation film 7A, a solution (polymerizable liquid crystal compound solution: liquid composition) containing the polymerizable liquid crystal compound is applied (coated) on the base film 8A to form a coating film, and It is photopolymerized to form an extremely thin one as described above. An alignment film may be provided on this base film 8A in order to align the polymerizable liquid crystal compound. The alignment film may be any one that is photo-aligned by polarized light irradiation or is mechanically aligned by polishing treatment. In addition, as a specific example of this alignment film, those described in the above-mentioned gazette can be used. The retardation film 7A formed in this way is completely bonded to another film together with the base film 8A, and after that, the base film 8A is peeled off, so that the retardation film 7A can be transferred to the other film.

When forming the retardation film 7A, if there are foreign matters on the base film 8A to be coated with the polymerizable liquid crystal compound solution, or the base film 8A itself is damaged, there will be a problem of coating the polymerizable liquid crystal compound solution. The obtained coating film itself has defects. In addition, in the case where the alignment film is subjected to polishing treatment, there are also debris of the polishing cloth remaining on the alignment film, and this debris may cause defects in the coating film of the polymerizable liquid crystal compound solution (liquid crystal cured film formation composition) situation. In this way, when a retardation film is formed from a polymerizable liquid crystal compound, although an extremely thin retardation film can be formed, the above-mentioned dust or damage may cause optical defects in the retardation film.

The base film 8A to which the polymerizable liquid crystal compound solution is to be applied is in a laminated state with the retardation film 7A during defect inspection of the retardation film 7A, so it is desirable that the retardation value is small. However, in this embodiment, the in-plane retardation value of the base film 8A at a wavelength of 550 nm is 50 nm or more. The in-plane retardation value may be 100 nm or greater, 500 nm or greater, 1000 nm or greater, 2000 nm or greater, 5000 nm or greater, or 8000 nm or greater. Even in the case where the base film 8A has such a retardation, according to the inspection device of this embodiment, it is not affected by the retardation of the base film 8A, and it is easy to judge whether the retardation film 7A is defective or not. .

As for the material constituting the base film 8A, those described in the above-mentioned publications can be cited, and among them, polyethylene terephthalate (PET) is particularly preferred. The thickness of the base film 8A may be 10 to 500 μm, 30 to 300 μm, 50 to 200 μm, or 80 to 150 μm.

In the inspection apparatus 1A, the first linear polarizing plate 3 is a film that converts light incident from the light source 2 into linearly polarized light, and a protective film is bonded to at least one surface of the polarizing film. As for the polarizing film, for example, a polyvinyl alcohol (polyvinyl alcohol) film has iodine or a dichroic dye adsorbed and aligned, or a polymerized liquid crystal compound has a polymerizable liquid crystal compound adsorbed and aligned with a dichroic dye.

Here, the protective film is used to protect the polarizing film. In terms of the protective film, the purpose is to obtain a polarizing plate with appropriate mechanical strength, and those commonly used in the technical field of polarizing plates are used. Typically, triacetyl cellulose (TAC) film and other cellulose ester film, cyclic olefin (olefine) film, polyethylene terephthalate (PET) film and other poly Methacrylic film such as polyester film, polymetylmethacry late (PMMA) film, etc. In addition, additives commonly used in the technical field of polarizing plates may be included in the protective film. The retardation of the protective film used in the linear polarizing plate is preferably smaller. For example, if Re (550) is preferably 10 nm or less, and 5 nm or less is particularly preferred.

Although various commercially available products can be used for the light source 2, it is advantageous to use linear light (including those similar to linear light) such as laser light. The light emitted by the light source 2 is unpolarized light, and becomes polarized light in a predetermined direction through the first linear polarizer 3, and becomes circularly polarized light through the retardation film 7A. That is, unpolarized light passes through the first linear polarizing plate 3 and the retardation film 7A to become circularly polarized light.

The retardation filter 4 includes a retardation film 7B. For the retardation filter 4, the in-plane retardation value at the wavelength of 550 nm and the in-plane retardation value at the wavelength of 550 nm of the retardation film 7A belonging to the inspection object are used substantially the same. When determining an optical defect from the brightness (lightness) information ΔL*, the retardation filter 4 preferably uses a film having the same structure as the inspection object 10. In addition, when determining an optical defect from the color difference information ΔE*, the retardation filter 4 preferably uses a film having a wavelength dispersibility opposite to that of the inspection object 10. In terms of the direction in which the retardation filter 4 is arranged, it is assumed that the slow axis of the retardation film 7A and the slow axis of the retardation filter 4 are substantially orthogonal to each other. That is, in the case of inspecting the inspection object 10, the phase difference filter 4 always adjusts its direction so as to form a cross polarizer with the retardation film 7A in the inspection object 10.

In addition, the phase difference filter 4 may be further equipped with a positive C plate. The positive C plate may be provided on the surface facing the retardation film 7A, or may be provided on the surface on the opposite side. The detection area can be enlarged by using a positive C plate. The thickness direction retardation value (Rth(550)) of the positive C plate can be appropriately selected according to the thickness direction retardation value of the retardation film 7A to be inspected. For example, when the retardation film 7A is a λ/4 plate, By using the thickness direction retardation value (Rth(550)) of -50nm to -300nm, the effect can be easily obtained.

The retardation filter 4 may be provided with a retardation film 7B and a base film 8B on which the retardation film 7B is laminated. For the base film 8B, the in-plane retardation value (Re(550)) is substantially zero so as not to impair the optical characteristics of the retardation film 7B. Here, the in-plane retardation value is substantially zero, which means that the in-plane retardation value (Re(550)) is 3 nm or less.

Here, the method of obtaining the in-plane retardation value (Re(550)) and the thickness direction retardation value (Rth(550)) at a wavelength of 550 nm is shown. As described above, for example, a piece of about 40 mm×40 mm is divided from the film to be measured (divided from a long film using an appropriate cutting tool, etc.). The Re (550) of the piece was measured three times, and the average value of Re (550) was calculated. The Re (550) of the sheet was measured using a phase difference measuring device KOBRA-WPR (manufactured by Oji Measuring Instruments Co., Ltd.), and the measurement temperature was room temperature (23°C).

The second linear polarizing plate 5 is a film into which the light after passing through the phase difference filter 4 enters, and its composition or material is the same as that of the first linear polarizing plate 3. In the inspection apparatus 1A, the second linear polarizer 5 is arranged so as to form an orthogonal polarizer with the first linear polarizer 3.

Furthermore, in order to expand the detection area, a positive C plate may be arranged between the first linear polarizing plate 3 and the base film 8A. The retardation value (Rth(550)) in the thickness direction of the positive C plate can be appropriately selected according to the retardation value in the thickness direction of the base film 8A, for example, by setting the retardation in the thickness direction of the base film 8A The value (Rth(550)) is about 1/3 to 2/3 of the retardation value in the thickness direction, so that the effect is easy to obtain.

In the inspection apparatus 1A of this embodiment, in order to observe the light passing through the first linear polarizing plate 3, the inspected object 10, the retardation filter 4, and the second linear polarizing plate 5, the light is on the optical axis 9 and is in phase A camera (detection means) 6 is arranged at a position where the side having the light source 2 among the two sides of the difference filter 4 is the opposite side. The camera 6 is, for example, a CCD (Charge Coupled Device) camera. In this case, it can be automatically detected by image processing analysis combined with a CCD camera and an image processing device, and the object to be inspected 10 can be performed thereby. Inspection. Alternatively, in terms of detection means, a human may replace the camera 6 to observe the second linear polarizing plate 5 visually.

(Inspection Method)

The inspection method using the inspection device 1A is as follows. First, the inspection object 10 is arranged between the first linear polarizing plate 3 and the phase difference filter 4 in the interior of the inspection apparatus 1A. At this time, the inspection object 10 is arranged such that the side of the base film 8A faces the first linear polarizer 3 side, and the slow axis of the base film 8A is aligned with the polarization axis (transmission axis) of the first linear polarizer 3 ) Are approximately orthogonal or approximately parallel to each other. Furthermore, it is arranged such that the slow axis of the retardation film 7A and the slow axis of the retardation filter 4 are approximately orthogonal to each other, and further, the first linear polarizer 3 and the second linear polarizer 5 constitute an orthogonal polarizer. .

Light is irradiated from the light source 2 toward the first linear polarizing plate 3. The light emitted by the light source 2 is incident on the first linear polarizing plate 3, where the unpolarized light is converted into linearly polarized light. In addition, this linear polarization system is incident on the inspection object 10 from the base film 8A side. The linearly polarized light after passing through the base film 8A passes through the retardation film 7A to become circularly polarized light. This circularly polarized light enters the retardation filter 4 from the side of the retardation film 7B. Here, the retardation axis of the retardation film 7A and the retardation axis of the retardation filter 4 are approximately orthogonal to each other, and the in-plane retardation value of the retardation film 7A at a wavelength of 550 nm and the retardation filter 4 The in-plane retardation values at a wavelength of 550 nm are approximately the same as each other, so the light passing through the retardation filter 4 is converted into the original linearly polarized light. Furthermore, the light system that has passed through the phase difference filter 4 is then incident on the second linear polarizing plate 5. The second linear polarizer 5 is configured to be orthogonal to the first linear polarizer 3, that is, the penetration axis of the first linear polarizer 3 and the absorption axis of the second linear polarizer 5 become parallel, so it passes through the phase The optical system restored to the linearly polarized light by the difference filter 4 is blocked by the second linear polarizing plate 5. In this inspection, when there is no defect in the retardation film 7A in the inspected object 10, the entire surface of the second linear polarizing plate 5 appears uniformly black when viewed by the camera 6. On the other hand, when the retardation film 7A in the inspection object 10 has a defect, the light passing through the defect portion enters the retardation filter 4 in a state where it does not completely become the supposed circularly polarized light (elliptical polarized light). Furthermore, the circularly polarized light (elliptical polarized light) cannot be restored to positive when it passes through the phase difference filter 4. Normal linear polarized light becomes elliptical polarized light. Therefore, the second linear polarizing plate 5 cannot be properly blocked to allow light to leak, and the defective part is observed as a bright spot in the observation by the camera 6.

Here, the base film 8A has a retardation of "the in-plane retardation value at a wavelength of 550 nm is 50 nm or more." Therefore, the polarization state of the light after passing through the first linear polarizer 3 may be disturbed by the base film 8A. . However, in the inspection method of this embodiment, the polarization axis of the first linear polarizer 3 is arranged so that the slow axis of the base film 8A with phase difference is substantially orthogonal or substantially parallel to each other, so the first linear polarizer 3 The polarization state of the light behind the linear polarizing plate 3 will not be disturbed by the base film 8A. That is, the composed optical system functions as expected, and when a defect occurs in the retardation film 7A, the defect can be appropriately recognized in the observation field of view. Conventionally, when the in-plane retardation value of the base film 8A is 50 nm or more, the light after passing through the first linear polarizing plate 3 will become circularly polarized light (elliptical polarized light) due to the retardation of the base film 8A. The leakage of light from the two linear polarizers 5 increases, which becomes an obstacle to inspection. Therefore, according to the inspection method of this embodiment, the influence of the in-plane retardation of the base film 8A can be suppressed, and at the same time, it is easy to determine whether the retardation film has defects.

(Continuous inspection method)

As shown in FIG. 2, the inspection method of this embodiment can be combined with the step of continuously forming the retardation film 7A on the base film 8A, and can be continuously performed on the same manufacturing line as this step. The inspection system 100 shown in FIG. 2 is equipped with the following components in addition to the inspection device 1A described above to inspect the inspection object 10 on the production line: the alignment angle measuring device 12 is used to determine the basis before the formation of the retardation film 7A The direction of the late axis (alignment angle) of the material film 8A; and the angle adjustment mechanism 14, which adjusts the angle of the first linear polarizer 3 to the late axis of the base film 8A obtained by the alignment angle measuring device 12 The polarization axes of the first linear polarizer 3 and the first linear polarizer 3 are substantially orthogonal or substantially parallel to each other. Here, the inspection object 10 is passed through the inspection equipment while being transported. Set in the optical axis 9 of 1A, and accept the inspection for defects. Furthermore, the inspection object 10 after the inspection is finished is rolled up. In addition, here, the width of the base film 8A may be, for example, 0.5 to 2.0 m, or 1.0 to 1.5 m.

As shown in FIG. 3, in the inspection system 100, a plurality of inspection devices 1A are arranged in the entire width direction of the inspection object 10 (the direction perpendicular to the conveying direction). The inspection apparatus 1A is preferably arranged at 5 to 20 locations in the entire width direction of the inspection object 10, for example. In Fig. 3, five inspection devices 1A are arranged.

In the manufacturing line shown in FIG. 2, the long substrate film 8A is conveyed, and the orientation angle measuring device 12 is used to measure the direction of the slow axis of the substrate film 8A. At this time, when the base film 8A is manufactured by stretching, as shown in FIG. 4, the direction of the slow axis changes in its width direction. In Fig. 4, the arrow indicates the direction of the slow axis in this part. Therefore, the measurement by the alignment angle measuring device 12 is performed at a plurality of positions in the entire width direction of the base film 8A. The alignment angle measuring device 12 provides the angle adjustment mechanism 14 with the information of the measured lag phase axis. After that, while conveying the base film 8A, the polymerizable liquid crystal compound solution was coated on the base film 8A by the coating machine 16 to form the coating film 7a, and the coating film 7a was formed by a dryer disposed on the downstream side of the coating machine 16. 18 The coating film 7a is dried. Here, the applied polymerizable liquid crystal compound is aligned on the base film 8A, and is cured by drying and polymerization to become the retardation film 7A. The dried film is the inspection object 10, and is provided to the inspection device 1A arranged on the downstream side of the conveyance for inspection.

The angle adjustment mechanism 14 rotates the first linear polarizer 3 based on the information of the slow axis direction of the substrate film 8A provided from the alignment angle measuring device 12, and makes the polarization axis of the first linear polarizer 3 coincide with the substrate film The slow axis of 8A is approximately orthogonal or approximately parallel. At the same time, regarding the phase difference filter 4 and the second linear polarizing plate 5, they are also rotated so as to become the above-mentioned predetermined relationship. The plurality of inspection devices 1A arranged in the width direction of the inspection object 10 are each assigned a detection area A (see FIG. 3), and the inspection object 10 covers all areas in the width direction and is inspected. During the inspection, the angle adjustment mechanism 14 responds to the base film The slow axis of 8A changes in the entire width direction. The direction in which the polarization axis of the first linear polarizer 3 faces is different for each detection area A. In addition, the detection area A shown in FIG. 4 shows the portion corresponding to the detection area A shown in FIG. 3 on the base film 8A.

By using the inspection system 100, the formation and inspection of the retardation film 7A can be performed continuously and efficiently throughout the entire conveyance direction of the base film 8A, and therefore, the production and inspection of the inspection object 10 can be made more efficient. In addition, in the inspection system 100, a plurality of inspection devices 1A are arranged in the width direction of the inspection object 10. Therefore, even if the direction of the slow axis of the base film 8A is different in the width direction, each The relationship between the polarization axis of the first linear polarizer 3 in the inspection device 1A and the slow axis of the base film 8A in the detection area A is adjusted to a predetermined relationship. That is, at all positions in the width direction of the base film 8A, inspections that suppress the influence of the in-plane retardation of the base film 8A can be performed.

<Second Implementation Type>

The second embodiment of the present invention is described here. As the second embodiment, the inspection device 1B shown in FIG. 5 is different from the inspection device 1A of the first embodiment in that the positions of the light source 2 and the detection means are opposite. In other words, the inspection device 1B is configured by sequentially arranging a camera (detection means) 6, a first linear polarizing plate 3, a phase difference filter 4, a second linear polarizing plate 5, and a light source 2 in this order. In FIG. 5, the state where the inspection object 10 belonging to the inspection target is arranged between the first linear polarizing plate 3 and the phase difference filter 4 is depicted. Here, regarding the arrangement of the inspection object 10 and the second linear polarizing plate 5, they are arranged so that the slow axis of the base film 8A and the polarization axis of the second linear polarizing plate 5 are substantially orthogonal or substantially parallel to each other.

In the inspection of the inspection object 10 using this inspection apparatus 1B, it is also easy to inspect the retardation film 7A for defects by the same principle as in the first embodiment.

In summary, although the preferred embodiments of the present invention have been described, the present invention is not limited to the above-mentioned embodiments.

[Industrial availability]

The present invention can be used in inspections for judging the presence or absence of defects in the retardation film.

1A: Inspection device

2: light source

3: The first linear polarizer

4: Phase difference filter

5: The second linear polarizer

6: Camera (detection means)

7A, 7B: retardation film

8A, 8B: base film

9: Optical axis

10: Object to be inspected

Claims (7)

An inspection method in which light is injected into a film-like inspection object to determine whether the retardation film is defective. The film-like inspection object is equipped with a base film with an in-plane retardation value of 50nm or more at a wavelength of 550nm , And the aforementioned retardation film composed of a cured product of a polymerizable liquid crystal compound formed on one side of the aforementioned base film; in the aforementioned inspection method, The first linear polarizing plate, the aforementioned inspection object, the phase difference filter, and the second linear polarizing plate are arranged in order, The surface on the side of the substrate film of the inspection object faces the side of the first linear polarizing plate, The slow axis of the base film and the polarization axis of the first linear polarizer or the second linear polarizer are substantially orthogonal or substantially parallel to each other, The slow axis of the retardation film and the slow axis of the retardation filter are approximately orthogonal to each other, The in-plane retardation value of the aforementioned retardation film at a wavelength of 550nm and the in-plane retardation value of the aforementioned retardation filter at a wavelength of 550nm are approximately the same as each other, The first linear polarizer and the second linear polarizer constitute an orthogonal polarizer, and Light is incident from either the first linear polarizing plate side or the second linear polarizing plate side so that the optical axis passes through the predetermined inspection area on the inspection object, and from the first linear polarizing plate side or the aforementioned Observe the second linear polarizing plate or the first linear polarizing plate on the other side of the second linear polarizing plate side. The inspection method according to claim 1 includes a step of obtaining the direction of the retardation axis of the base film in advance by using an orientation angle measuring device for the base film before forming the retardation film. The inspection method according to claim 2 includes: after the lag axis of the base film is obtained by the alignment angle measuring device, one side of the base film is coated with a polymerizable liquid crystal compound Liquid composition, a coating film containing the polymerizable liquid crystal compound is formed on the surface of the base film, and the polymerizable liquid crystal compound contained in the coating film is aligned and cured to form the retardation film step. According to the inspection method described in any one of claims 1 to 3, the inspection object is conveyed between the first linear polarizing plate and the retardation filter in the longitudinal direction of the inspection object, and at the same time The inspection is carried out continuously in the longitudinal direction. In the inspection method described in any one of claims 1 to 4, the inspection area is provided at a plurality of locations in the width direction of the inspection object. An inspection device that injects light into a film-like inspection object to determine whether the retardation film is defective. The film-like inspection object is equipped with a base film with an in-plane retardation value of 50nm or more at a wavelength of 550nm , And the aforementioned retardation film composed of a cured product of a polymerizable liquid crystal compound formed on one side of the aforementioned base film, and the inspection device is provided with: The first linear polarizer and the phase difference filter are arranged across the place where the inspection object is arranged; The second linear polarizing plate is arranged in an area on the opposite side of the place where the inspection object is arranged in terms of the phase difference filter; and The light source, in terms of the first linear polarizing plate or the second linear polarizing plate, is arranged in an area on the opposite side to the place where the inspection object is arranged; The first linear polarizing plate or the second linear polarizing plate is arranged such that its polarization axis and the slow axis of the base film are substantially orthogonal or substantially parallel to each other, The retardation filter is arranged such that its slow axis and the slow axis of the retardation film are substantially orthogonal to each other, The first linear polarizing plate and the second linear polarizing plate form an orthogonal polarizer, The in-plane retardation of the aforementioned retardation filter at a wavelength of 550nm is set to be approximately the same as the in-plane retardation value of the aforementioned retardation film at a wavelength of 550nm, and The light source is arranged in positions where the first linear polarizing plate, the predetermined detection area on the inspection object, the phase difference filter, and the second linear polarizing plate are arranged on the optical axis. An inspection system with: The inspection device described in claim 6; An alignment angle measuring device to obtain the slow axis of the base film before the retardation film is formed; and The angle adjustment mechanism adjusts the angle of the first linear polarizer so that the slow axis of the base film and the polarization axis of the first linear polarizer obtained by the alignment angle measuring device become approximately orthogonal to each other or Roughly parallel.

Images