TW202124098A - Processing unit and substrate processing device - Google Patents
Processing unit and substrate processing device Download PDFInfo
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- TW202124098A TW202124098A TW109141274A TW109141274A TW202124098A TW 202124098 A TW202124098 A TW 202124098A TW 109141274 A TW109141274 A TW 109141274A TW 109141274 A TW109141274 A TW 109141274A TW 202124098 A TW202124098 A TW 202124098A
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- 239000000758 substrate Substances 0.000 title claims abstract description 141
- 238000005498 polishing Methods 0.000 claims abstract description 149
- 230000007246 mechanism Effects 0.000 claims abstract description 48
- 238000004140 cleaning Methods 0.000 claims description 42
- 239000007788 liquid Substances 0.000 description 15
- 238000009966 trimming Methods 0.000 description 13
- 238000006073 displacement reaction Methods 0.000 description 11
- 238000001035 drying Methods 0.000 description 11
- 238000000227 grinding Methods 0.000 description 10
- 239000007789 gas Substances 0.000 description 6
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 6
- 239000010410 layer Substances 0.000 description 5
- 238000005406 washing Methods 0.000 description 5
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 4
- 229920001940 conductive polymer Polymers 0.000 description 3
- 229910003460 diamond Inorganic materials 0.000 description 3
- 239000010432 diamond Substances 0.000 description 3
- 239000012530 fluid Substances 0.000 description 3
- 239000002245 particle Substances 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- 239000003638 chemical reducing agent Substances 0.000 description 2
- 238000010276 construction Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 229910052757 nitrogen Inorganic materials 0.000 description 2
- 238000007493 shaping process Methods 0.000 description 2
- 238000005507 spraying Methods 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- YCKRFDGAMUMZLT-UHFFFAOYSA-N Fluorine atom Chemical compound [F] YCKRFDGAMUMZLT-UHFFFAOYSA-N 0.000 description 1
- 229920005830 Polyurethane Foam Polymers 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 230000008094 contradictory effect Effects 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000004744 fabric Substances 0.000 description 1
- 239000000835 fiber Substances 0.000 description 1
- 229910052731 fluorine Inorganic materials 0.000 description 1
- 239000011737 fluorine Substances 0.000 description 1
- 239000004745 nonwoven fabric Substances 0.000 description 1
- 238000007517 polishing process Methods 0.000 description 1
- 229920002635 polyurethane Polymers 0.000 description 1
- 239000004814 polyurethane Substances 0.000 description 1
- 239000011496 polyurethane foam Substances 0.000 description 1
- 239000011148 porous material Substances 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 239000011435 rock Substances 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
- 229920002803 thermoplastic polyurethane Polymers 0.000 description 1
- 230000007723 transport mechanism Effects 0.000 description 1
Images
Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/34—Accessories
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B53/00—Devices or means for dressing or conditioning abrasive surfaces
- B24B53/017—Devices or means for dressing, cleaning or otherwise conditioning lapping tools
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B53/00—Devices or means for dressing or conditioning abrasive surfaces
- B24B53/12—Dressing tools; Holders therefor
- B24B53/14—Dressing tools equipped with rotary rollers or cutters; Holders therefor
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B55/00—Safety devices for grinding or polishing machines; Accessories fitted to grinding or polishing machines for keeping tools or parts of the machine in good working condition
- B24B55/06—Dust extraction equipment on grinding or polishing machines
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
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- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Grinding-Machine Dressing And Accessory Apparatuses (AREA)
- Cleaning Or Drying Semiconductors (AREA)
Abstract
Description
本申請案係關於一種處理單元及基板處理裝置。本申請案主張依據2019年12月10日申請之日本專利申請編號第2019-222928號的優先權。包含日本專利申請編號第2019-222928號之說明書、申請專利範圍、圖式及摘要之全部揭示內容整體援用於本申請案供參照。This application is related to a processing unit and a substrate processing device. This application claims priority based on Japanese Patent Application No. 2019-222928 filed on December 10, 2019. The entire disclosure including the specification, application scope, drawings and abstract of Japanese Patent Application No. 2019-222928 is incorporated into this application as a whole for reference.
製造半導體元件時,為了將基板表面平坦化而使用化學機械研磨(CMP)裝置。使用於製造半導體元件之基板多為圓板形狀。此外,不限於半導體元件,將CCL基板(銅箔積層(Copper Clad Laminate)基板)、PCB(印刷回路板(Printed Circuit Board))基板、光罩基板、顯示面板等四方形之基板表面平坦化時平坦度的要求也提高。此外,對於PCB基板等配置了電子元件之封裝基板表面平坦化的要求也提高。When manufacturing semiconductor elements, a chemical mechanical polishing (CMP) device is used in order to flatten the surface of the substrate. Most of the substrates used in the manufacture of semiconductor devices are in the shape of a circular plate. In addition, not limited to semiconductor components, when flattening the surface of square substrates such as CCL substrates (Copper Clad Laminate substrates), PCB (Printed Circuit Board) substrates, mask substrates, display panels, etc. The requirements for flatness have also increased. In addition, the demand for flattening the surface of package substrates equipped with electronic components such as PCB substrates has also increased.
化學機械研磨裝置等之基板處理裝置含有各種處理單元,其中一個包含用於修整(整形)用於研磨基板之研磨墊表面的修整器。修整器包含:安裝電沉積鑽石粒子等之修整構件的固持器;保持固持器之旋轉軸桿;使旋轉軸桿旋轉之馬達;及使固持器升降運動之升降機構。修整器係以藉由升降機構將修整構件接觸於研磨墊,並藉由使旋轉軸桿旋轉來修整研磨墊表面之方式構成。 [先前技術文獻] [專利文獻]Substrate processing devices such as chemical mechanical polishing devices contain various processing units, one of which includes a dresser for dressing (shaping) the surface of the polishing pad used for polishing the substrate. The dresser includes: a holder for installing dressing components such as electrodeposited diamond particles; a rotating shaft to hold the holder; a motor to rotate the rotating shaft; and a lifting mechanism to move the holder up and down. The dresser is constructed by contacting the dressing member with the polishing pad by a lifting mechanism, and dressing the surface of the polishing pad by rotating a rotating shaft. [Prior Technical Literature] [Patent Literature]
[專利文獻1]日本特開2008-110471號公報[Patent Document 1] JP 2008-110471 A
(發明所欲解決之問題)(The problem to be solved by the invention)
隨著近年來基板之大型化,研磨墊也不斷大型化,使用過去尺寸之修整器進行研磨墊的修整時,會擔心修整不足。另外,為了不致發生修整不足,也考慮增加修整時間,不過從處理效率之觀點而言這並不妥當。With the increase in the size of substrates in recent years, the polishing pad has also been increasing in size. When a dresser of the past size is used to dress the polishing pad, there is a concern about insufficient dressing. In addition, in order to prevent insufficient trimming, it is also considered to increase the trimming time, but this is not appropriate from the viewpoint of processing efficiency.
關於這一點,雖然可藉由增大修整器之直徑而有效且充分地進行修整,不過,因為增大修整器之直徑可能造成基板處理裝置之腳印變大,所以也不妥當。Regarding this point, although it is possible to effectively and adequately perform trimming by increasing the diameter of the trimmer, it is not appropriate because increasing the diameter of the trimmer may cause the footprint of the substrate processing apparatus to become larger.
此種問題不僅是修整器,就連包含用於清洗面朝上配置之基板表面的清洗具之處理單元;或是用於對研磨墊面朝下研磨基板之處理單元也同樣會發生。This kind of problem occurs not only in the dresser, but also in the processing unit including the cleaning tool for cleaning the surface of the substrate arranged face up; or the processing unit for polishing the substrate with the polishing pad face down.
因此,本申請案之一個目的為抑制基板處理裝置之腳印增大,且使基板處理裝置之處理單元的處理效率提高。 (解決問題之手段)Therefore, one of the objectives of the present application is to suppress the increase in the footprint of the substrate processing apparatus and to improve the processing efficiency of the processing unit of the substrate processing apparatus. (Means to solve the problem)
一個實施形態揭示一種處理單元,係用於基板處理裝置,且包含:旋轉軸桿,其係與基板或用於研磨基板之研磨墊相對配置;複數個固持器,其係保持在前述旋轉軸桿之軸心周圍經由手臂而同心狀配置的複數個處理具或複數個處理對象物;驅動部,其係將前述複數個固持器在對前述基板或前述研磨墊靠近或離開之方向驅動;及折疊機構,其係以前述複數個固持器分別靠近之方式可調整前述手臂之角度而構成。One embodiment discloses a processing unit used in a substrate processing device, and includes: a rotating shaft, which is arranged opposite to a substrate or a polishing pad used for polishing the substrate; and a plurality of holders, which are held on the aforementioned rotating shaft A plurality of treatment tools or a plurality of treatment objects are arranged concentrically around the axis through the arms; a driving part which drives the plurality of holders in the direction of approaching or away from the substrate or the polishing pad; and folding The mechanism is constructed by adjusting the angle of the arm in a manner that the plurality of holders are approached respectively.
以下,配合附圖說明具備作為本發明之處理單元的一例之修整單元的基板處理裝置之實施形態。附圖中,在相同或類似之元件上註記相同或類似之參考符號,在各實施形態之說明中會省略關於相同或類似元件的重複說明。此外,各實施形態顯示之特徵只要彼此不矛盾,亦可適用於其他實施形態。Hereinafter, an embodiment of a substrate processing apparatus including a trimming unit as an example of the processing unit of the present invention will be described with reference to the drawings. In the drawings, the same or similar reference signs are added to the same or similar elements, and repeated descriptions about the same or similar elements will be omitted in the description of each embodiment. In addition, as long as the features shown in each embodiment are not contradictory to each other, they can also be applied to other embodiments.
圖1係顯示一種實施形態之基板處理裝置1000的整體構成之俯視圖。圖1所示之基板處理裝置1000具有:裝載單元100、搬送單元200、研磨單元300、乾燥單元500、及卸載單元600。圖示之實施形態中,搬送單元200具有2個搬送單元200A、200B,研磨單元300具有2個研磨單元300A、300B。一種實施形態中,此等各單元可獨立地形成。藉由獨立地形成此等單元,可藉由任意組合各單元數可輕易形成不同構成之基板處理裝置1000。此外,基板處理裝置1000具備控制裝置900,基板處理裝置1000之各元件藉由控制裝置900控制。一種實施形態中,控制裝置900可由具備輸入輸出裝置、運算裝置、記憶裝置等之一般電腦構成。
<裝載單元>FIG. 1 is a plan view showing the overall structure of a
裝載單元100係用於將進行研磨及清洗等之處理前的基板WF導入基板處理裝置1000中的單元。一種實施形態中,裝載單元100係依據SMEMA(表面貼裝設備製造商協會(Surface Mount Equipment Manufacturers Association))之機械裝置介面規格(IPC-SMEMA-9851)而構成。The
圖示之實施形態中,裝載單元100之搬送機構具有:複數個搬送軋輥202、及安裝搬送軋輥202之複數個軋輥軸桿204。圖1所示之實施形態中,各軋輥軸桿204上安裝有3個搬送軋輥202。基板WF配置於搬送軋輥202上,並藉由搬送軋輥202旋轉來搬送基板WF。軋輥軸桿204上之搬送軋輥202的安裝位置不拘,只要是可穩定地搬送基板WF的位置即可。但是,由於搬送軋輥202接觸於基板WF,因此應以搬送軋輥202接觸之方式配置於即使接觸於處理對象之基板WF仍無問題的區域。一種實施形態中,裝載單元100之搬送軋輥202可由導電性聚合物構成。一種實施形態中,搬送軋輥202經由軋輥軸桿204等而電性接地。此因,為了防止基板WF帶電而損傷基板WF上之電子元件等。此外,一種實施形態中,為了防止基板WF帶電,亦可在裝載單元100中設置電離器(無圖示)。
<搬送單元>In the illustrated embodiment, the transport mechanism of the
圖1所示之基板處理裝置1000具備2個搬送單元200A、200B。2個搬送單元200A、200B可為相同構成,因此,以下一併作為搬送單元200來說明。The
圖示之搬送單元200具備用於搬送基板WF之複數個搬送軋輥202。藉由使搬送軋輥202旋轉,可在指定方向搬送搬送軋輥202上之基板WF。搬送單元200之搬送軋輥202亦可由導電性聚合物而形成,亦可由非導電性之聚合物而形成。搬送軋輥202藉由無圖示之馬達而驅動。基板WF藉由搬送軋輥202搬送至基板交接位置。The
一種實施形態中,搬送單元200具有清洗噴嘴284。清洗噴嘴284連接於無圖示之清洗液的供給源。清洗噴嘴284係以對藉由搬送軋輥202而搬送之基板WF供給清洗液的方式構成。
<研磨單元>In one embodiment, the
圖2係概略顯示一種實施形態之研磨單元300的構成之立體圖。圖1所示之基板處理裝置1000具備2個研磨單元300A、300B。2個研磨單元300A、300B可為相同構成,因此,以下一併作為研磨單元300來說明。FIG. 2 is a perspective view schematically showing the structure of a
如圖2所示,研磨單元300具備:研磨台350;及構成保持研磨對象物之基板,並按壓於研磨台350上之研磨面的研磨頭之上方環形轉盤302。研磨台350經由台軸桿351而連結於配置在其下方之研磨台旋轉馬達(無圖示),並可在台軸桿351周圍旋轉。在研磨台350之上面貼合有研磨墊352,研磨墊352之表面352a構成研磨基板之研磨面。一種實施形態中,研磨墊352亦可經由用於可輕易從研磨台350剝離之層而貼合。此種層例如為矽層及氟系樹脂層等,亦可使用例如記載於日本特開2014-176950號公報等者。As shown in FIG. 2, the
在研磨台350上方設置有研磨液供給噴嘴354,藉由該研磨液供給噴嘴354可在研磨台350上之研磨墊352上供給研磨液。此外,如圖2所示,研磨台350及台軸桿351中設有用於供給研磨液之通路353。通路353連通於研磨台350表面之開口部355。在對應於研磨台350之開口部355的位置,研磨墊352形成有貫穿孔357,通過通路353之研磨液從研磨台350之開口部355及研磨墊352的貫穿孔357供給至研磨墊352表面。另外,研磨台350之開口部355及研磨墊352的貫穿孔357亦可係一個或是複數個。此外,研磨台350之開口部355及研磨墊352的貫穿孔357之位置不拘,一種實施形態中,係配置於研磨台350之中心附近。A polishing
一種實施形態中,研磨單元300具備用於將液體、或液體與氣體之混合流體朝向研磨墊352噴射的霧化器358(參照圖1),不過圖2中並未顯示。從霧化器358噴射之液體例如係純水,氣體例如係氮氣。In one embodiment, the polishing
上方環形轉盤302連接於上方環形轉盤軸桿18,該上方環形轉盤軸桿18藉由上下運動機構319可對搖動手臂360上下運動。藉由該上方環形轉盤軸桿18之上下運動,可使整個上方環形轉盤302對搖動手臂360上下運動來進行定位。上方環形轉盤軸桿18可藉由無圖示之上方環形轉盤旋轉馬達的驅動而旋轉。上方環形轉盤302藉由上方環形轉盤軸桿18之旋轉而以上方環形轉盤軸桿18為中心而旋轉。另外,在上方環形轉盤軸桿18之上端安裝有旋轉接頭323。The upper
另外,在市場上可獲得各種研磨墊,例如有NITTAHAAS股份有限公司製之SUBA800(「SUBA」係註冊商標)、IC-1000、IC-1000/SUBA400(兩層布),FUJIMI Inc.公司製之Surfin xxx-5、Surfin 000等(「surfin」係註冊商標)。SUBA800、Surfin xxx-5、Surfin 000係以氨基甲酸乙酯樹脂固定纖維之不織布,IC-1000係硬質發泡聚氨酯(單層)。發泡聚氨酯形成有孔的(多孔質狀),其表面具有許多微細的凹處或是孔。In addition, various polishing pads are available on the market, such as Suba800 (“SUBA” is a registered trademark) manufactured by NITTAHAAS Co., Ltd., IC-1000, IC-1000/SUBA400 (two-layer cloth), and manufactured by FUJIMI Inc. Surfin xxx-5, Surfin 000, etc. ("surfin" is a registered trademark). SUBA800, Surfin xxx-5, Surfin 000 are non-woven fabrics with urethane resin fixed fiber, and IC-1000 is rigid foamed polyurethane (single layer). Polyurethane foam is porous (porous), and its surface has many fine recesses or pores.
上方環形轉盤302可在其下面保持四方形之基板。搖動手臂360以支軸362為中心可回轉地構成。上方環形轉盤302藉由搖動手臂360之回轉,可在上述搬送單元200之基板交接位置與研磨台350的上方之間移動。藉由使上方環形轉盤軸桿18下降,而使上方環形轉盤302下降,可將基板按壓於研磨墊352之表面(研磨面)352a。此時,分別使上方環形轉盤302及研磨台350旋轉,並從設於研磨台350上方之研磨液供給噴嘴354及/或設於研磨台350之開口部355在研磨墊352上供給研磨液。因此,可將基板WF按壓於研磨墊352之研磨面352a來研磨基板表面。在基板WF研磨中,亦可以上方環形轉盤302通過研磨墊352之中心的方式(覆蓋研磨墊352之貫穿孔357的方式)固定搖動手臂360或使其搖動。The
使上方環形轉盤軸桿18及上方環形轉盤302上下運動之上下運動機構319具備:經由軸承321可旋轉地支撐上方環形轉盤軸桿18之橋接器28;安裝於橋接器28之滾珠螺桿32;藉由支柱130所支撐之支撐台29;及設於支撐台29上之AC伺服馬達38。支撐伺服馬達38之支撐台29經由支柱130而固定於搖動手臂360。The up-and-down
滾珠螺桿32具備:連結於伺服馬達38之螺絲軸32a;及該螺絲軸32a螺合之螺帽32b。上方環形轉盤軸桿18與橋接器28成為一體而上下運動。因此,驅動伺服馬達38時,橋接器28經由滾珠螺桿32而上下運動,藉此,上方環形轉盤軸桿18及上方環形轉盤302上下運動。研磨單元300具備作為檢測橋接器28至下面的距離,亦即橋接器28之位置的位置檢測部之測距感測器70。藉由該測距感測器70檢測橋接器28之位置,可檢測上方環形轉盤302的位置。測距感測器70與滾珠螺桿32、伺服馬達38一起構成上下運動機構319。另外,測距感測器70亦可係雷射式感測器、超音波感測器、過電流式感測器、或線位移式感測器。此外,測距感測器70、伺服馬達38等研磨單元內之各設備係構成藉由控制裝置900來控制。The ball screw 32 includes: a
一種實施形態之研磨單元300具備修整研磨墊352之研磨面352a的修整單元356。關於修整單元356使用圖2概略說明後,再使用圖3至圖10詳細說明。如圖2所示,修整單元356具備:滑動接觸於研磨面352a之修整器(修整構件固持器)50;連結修整器50之修整器軸桿51;用於升降驅動修整器軸桿51之空氣汽缸53;及旋轉自如地支撐修整器軸桿51之搖動手臂55。圖2為了簡化說明而圖示一個修整器50,不過,本實施形態如後述包含複數個修整器。在修整器50之下部保持有修整構件50a,在該修整構件50a之下面電沉積針狀的鑽石粒子。空氣汽缸53配置於藉由支柱56所支撐的支撐台57上,此等支柱56固定於搖動手臂55。The polishing
搖動手臂55被無圖示之馬達驅動,並以支軸58為中心而回轉地構成。修整器軸桿51與研磨墊352相對配置,圖2係藉由無圖示之馬達驅動而旋轉,修整器50藉由該修整器軸桿51旋轉而在修整器軸桿51周圍旋轉。空氣汽缸53經由修整器軸桿51使修整器50上下運動,並將修整器50以指定之按壓力按壓於研磨墊352的研磨面352a。The
研磨墊352之研磨面352a的修整進行如下。修整器50藉由空氣汽缸53按壓於研磨面352a,與此同時,從無圖示之純水供給噴嘴供給純水至研磨面352a。在該狀態下,修整器50在修整器軸桿51周圍旋轉,使修整構件50a之下面(鑽石粒子)滑動接觸於研磨面352a。如此,藉由修整器50削除研磨墊352來修整研磨面352a。The dressing of the polishing
本實施形態之研磨裝置係利用該修整器50測量研磨墊352之磨耗量。亦即,修整單元356具備測量修整器50之變位的變位感測器60。該變位感測器60構成檢知研磨墊352之磨耗量的磨耗量檢知機構,並設於搖動手臂55的上面。修整器軸桿51上固定有目標板61,目標板61可隨著修整器50之上下運動而上下運動。變位感測器60以插通該目標板61之方式配置,並藉由測量目標板61之變位來測量修整器50的變位。另外,變位感測器60係使用線位移感測器、雷射式感測器、超音波感測器、或渦流式感測器等所有類型的感測器。The polishing apparatus of this embodiment uses the
本實施形態係如以下測量研磨墊352之磨耗量。首先,使空氣汽缸53驅動,而使修整器50抵接於初期整形完成之研磨墊352的研磨面352a。在該狀態下,變位感測器60檢知修整器50之初期位置(高度初期值),並將該初期位置(高度初期值)記憶於控制裝置900。而後,在一個或複數個基板之研磨處理結束後,再度使修整器50抵接於研磨面352a,並在該狀態下測量修整器50之位置。因為修整器50之位置依研磨墊352之磨耗量而變位於下方,所以控制裝置900藉由求出上述初期位置與研磨後之修整器50的位置之差,可求出研磨墊352之磨耗量。如此,依據修整器50之位置求出研磨墊352的磨耗量。
<乾燥單元>In this embodiment, the wear amount of the
乾燥單元500係用於使基板WF乾燥之裝置。圖1所示之基板處理裝置1000中,乾燥單元500在被研磨單元300研磨後,使藉由搬送單元200之清洗部清洗後的基板WF乾燥。如圖1所示,乾燥單元500配置於搬送單元200之下游。The drying
乾燥單元500具有用於朝向在搬送軋輥202上搬送之基板WF噴射氣體的噴嘴530。氣體例如可為壓縮之空氣或氮氣。藉由乾燥單元500將搬送之基板WF上的水滴吹散,可使基板WF乾燥。
<卸載單元>The drying
卸載單元600係用於將進行研磨及清洗等之處理後的基板WF搬出基板處理裝置1000外的單元。圖1所示之基板處理裝置1000中,卸載單元600收容經乾燥單元500乾燥後之基板。如圖1所示,卸載單元600配置於乾燥單元500之下游。The
一種實施形態中,卸載單元600係依據SMEMA(表面貼裝設備製造商協會(Surface Mount Equipment Manufacturers Association))之機械裝置介面規格(IPC-SMEMA-9851)而構成。
<修整單元>In one embodiment, the
其次,詳細說明用於基板處理裝置之處理單元的一例之修整單元356。圖3係概略顯示一種實施形態之修整單元356的構成之縱剖面圖。如圖3所示,上述之修整器軸桿51經由球花鍵72而保持於搖動手臂55。修整器軸桿51經由修整器側齒輪82及馬達側齒輪84而連接於馬達86及減速機88,並以藉由驅動馬達86而旋轉之方式構成。亦可取代修整器側齒輪82及馬達側齒輪84而設置滑輪及皮帶。此外,修整器軸桿51經由軸承74而保持於殼體76,並在殼體76上設置旋轉接頭78。亦可取代旋轉接頭78而設置集電環。上述之空氣汽缸53經由負載傳感器54而連接有目標板61,並以經由目標板61使修整器軸桿51升降運動之方式構成。空氣汽缸53係將後述之複數個修整器在對研磨墊352靠近或離開之方向驅動的驅動部之一例。此外,驅動部亦可使用空氣汽缸53以外之流體機械。此外,亦可取代流體機械而使用馬達等之電動機。此時,修整器軸桿51之升降機構亦可採用與組合使上述上方環形轉盤軸桿18及上方環形轉盤302升降之滾珠螺桿32及伺服馬達38等的上下運動機構319同樣的構成。Next, the
在修整器軸桿51之下端部設置修整器50及折疊機構450。修整器50及折疊機構450在圖3中省略,以下詳細作說明。圖4係概略顯示一種實施形態之修整器及折疊機構的構成之俯視圖。圖5係概略顯示一種實施形態之修整器及折疊機構的構成之縱剖面圖,且顯示打開修整器之狀態。圖6係概略顯示一種實施形態之修整器及折疊機構的構成之縱剖面圖,且顯示折疊修整器之狀態。圖7係概略顯示使用一種實施形態之修整單元進行修整情形的俯視圖。A
如圖4至圖6所示,修整單元356包含在修整器軸桿51之軸心周圍放射狀伸展的手臂410。此外,修整單元356包含保持對修整器軸桿51之軸心經由手臂410而同心狀配置的修整構件50-1a, 50-2a, 50-3a之修整器(修整構件固持器)50-1, 50-2, 50-3。本實施形態係顯示修整單元356包含3個修整器50-1, 50-2, 50-3之例,不過修整器可為2個以上之任意數。As shown in FIGS. 4 to 6, the
修整單元356包含以修整器50-1, 50-2, 50-3分別靠近之方式可調整手臂410的角度而構成之折疊機構450。折疊機構450包含:安裝於手臂410之蝸輪430;與蝸輪430嚙合之蝸桿420;及用於旋轉驅動蝸桿420之旋轉致動器440。The
具體而言,在修整器軸桿51之下端連接有殼體442,在殼體442中配置旋轉致動器440。在旋轉致動器440中,經由旋轉接頭78供給用於旋轉驅動蝸桿420之氣體。旋轉致動器440為電動情況下。係經由集電環供給用於旋轉驅動蝸桿420之電信號。蝸桿420從旋轉致動器440伸展至下方,並經由軸承422而保持於殼體442。在蝸桿420中形成有螺旋齒輪,藉此,蝸桿420與蝸輪430可相互嚙合。另外,亦可取代蝸桿420與蝸輪430而設置齒條齒輪及1/4圓小齒輪。此時,旋轉致動器440可為直動式之致動器(空氣汽缸或直動式之電動致動器)。Specifically, a
手臂410包含:從殼體442向下方伸展之第一手臂410a;及對第一手臂410a經由旋轉關節414,而在修整器軸桿51之軸心周圍放射狀伸展的第二手臂410b。第二手臂410b可藉由旋轉關節414而改變角度。蝸輪430連結於第二手臂410b。在第二手臂410b之前端經由球面接頭416分別安裝修整器50-1, 50-2, 50-3。藉由設置球面接頭416可將修整構件50-1a, 50-2a, 50-3a之修整面對研磨墊352平行。The
第一手臂410a上設置從第一手臂410a向放射方向伸出之凸緣418,凸緣418中以貫穿凸緣418之方式安裝止動螺栓412(止動器)。止動螺栓412藉由從凸緣418貫穿而突出之部分與手臂410(第二手臂410b)接觸,來管制手臂410(第二手臂410b)在各修整器50-1, 50-2, 50-3之離開方向的移動。另外,旋轉致動器440亦可係伺服馬達。使用附制動器之伺服馬達情況下,可省略止動螺栓412。The
藉由旋轉致動器440使蝸桿420在指定方向(例如順時鐘)旋轉時,與蝸桿420嚙合之蝸輪430旋轉,隨之第二手臂410b以向外側打開之方式角度變化。第二手臂410b與止動螺栓412接觸時,如圖5所示,變成修整器50-1, 50-2, 50-3打開之狀態。所謂修整器50-1, 50-2, 50-3打開之狀態,係修整構件50-1a, 50-2a, 50-3a之修整面與研磨墊352實質地平行的狀態。在修整器50-1, 50-2, 50-3打開狀態下,藉由使用空氣汽缸53而使修整器50-1, 50-2, 50-3下降,而將修整構件50-1a, 50-2a, 50-3a按壓於研磨墊352。在該狀態下,如圖7所示,使研磨台350(研磨墊352)旋轉而且藉由馬達86使修整器50-1, 50-2, 50-3旋轉,藉由將修整液(純水)供給至研磨面352a可修整(整形)研磨墊352。在修整中,藉由以支軸58為中心使搖動手臂55搖動,可全面修整研磨墊352。When the
另外,修整結束時,如圖6所示,藉由空氣汽缸53使修整器50-1, 50-2, 50-3上升。在該狀態下,藉由旋轉致動器440使蝸桿420在指定方向之相反方向(例如逆時鐘)旋轉時,蝸輪430在相反方向旋轉,隨之,第二手臂410b以向內側關閉之方式角度變化。藉此,如圖6所示,修整器50-1, 50-2, 50-3變成折疊之狀態。所謂修整器50-1, 50-2, 50-3折疊之狀態,係藉由將第二手臂410b向內側關閉,連結修整器50-1, 50-2, 50-3最外周而形成之圓的直徑β,比在修整器50-1, 50-2, 50-3打開狀態下,連結修整器50-1, 50-2, 50-3最外周而形成之圓的直徑α小之狀態。In addition, at the end of the dressing, as shown in FIG. 6, the
採用本實施形態時,如圖5及圖7所示,藉由形成打開了修整器50-1, 50-2, 50-3之狀態,可使用實質地大直徑之修整器50進行修整。結果,即使隨著基板WF之大型化而研磨墊352大型化,仍可在短時間進行修整,因此可使基板處理裝置1000之處理單元(修整單元356)的處理效率提高。In this embodiment, as shown in FIGS. 5 and 7, by forming a state where the dressers 50-1, 50-2, and 50-3 are opened, it is possible to use a substantially large-
再者,採用本實施形態時,在不進行修整時,如圖6所示,藉由將修整器50-1, 50-2, 50-3形成折疊狀態,可謀求基板處理裝置1000節省空間化。亦即,不進行修整時,修整單元356如圖1所示,係以退到研磨台350之外側的方式配置。在該狀態下,若修整單元356具有大直徑之修整器,為了在修整器與研磨單元300的側壁之間設指定的間隙,就需要將研磨單元300之側壁往外側擴大,而導致基板處理裝置之腳印增大。另外,採用本實施形態時,如圖6所示,藉由將修整器50-1, 50-2, 50-3形成折疊狀態而配置於研磨台350的外側,不需要將研磨單元300之側壁往外側擴大,結果,可抑制基板處理裝置1000之腳印的增大。再者,採用本實施形態時,可抑制修整單元356及基板處理裝置1000之成本增大。亦即,隨著研磨墊352大型化而使用大直徑之修整器時,因為大直徑修整器之價格高,會導致修整單元356及基板處理裝置1000的成本增大。另外,採用本實施形態時,由於可照樣使用過去所使用之小直徑修整器,因此與使用大直徑修整器時比較,可抑制修整單元356及基板處理裝置1000之成本增大。Furthermore, in the case of this embodiment, when trimming is not performed, as shown in FIG. 6, by folding the trimmers 50-1, 50-2, and 50-3 in a folded state, the
其次,說明折疊機構450之修改例。圖8係概略顯示一種實施形態之修整器及折疊機構的構成之俯視圖。圖9係概略顯示一種實施形態之修整器及折疊機構的構成之縱剖面圖,且顯示打開修整器之狀態。圖10係概略顯示一種實施形態之修整器及折疊機構的構成之縱剖面圖,且顯示折疊修整器之狀態。Next, a modified example of the
如圖8至圖10所示,修整單元356包含在修整器軸桿51之軸心周圍放射狀伸展的手臂490。此外,修整單元356包含保持對修整器軸桿51之軸心經由手臂490而同心狀配置的修整構件50-1a, 50-2a, 50-3a之修整器(修整構件固持器)50-1, 50-2, 50-3。As shown in FIGS. 8 to 10, the
修整單元356包含以修整器50-1, 50-2, 50-3分別靠近之方式可調整手臂490之角度所構成的折疊機構450。折疊機構450包含:設於手臂490之並未設置修整器50-1, 50-2, 50-3的一方端部之第一旋轉關節462;及設於手臂490之中央部的第二旋轉關節464。此外,折疊機構450包含:連接於第二旋轉關節464之連桿466;及設於連桿466之端部的第三旋轉關節468。此外,折疊機構450包含:安裝了第三旋轉關節468之直線軸桿470;及使直線軸桿470往返運動之直動致動器480。The
具體而言,在修整器軸桿51之下端連接有殼體482,在殼體482中配置直動致動器480。直動致動器480中經由旋轉接頭78供給用於使直線軸桿470往返運動之氣體。直動致動器480係電動情況下,係經由集電環供給用於使直線軸桿470往返運動之電信號。直線軸桿470從直動致動器480伸展至下方。在殼體482之下部設置從直線軸桿470放射方向伸出之凸緣484,凸緣484中,以貫穿凸緣484之方式安裝止動器螺栓(止動器)492。止動器螺栓492藉由從凸緣484貫穿而突出之部分與手臂490接觸,來管制手臂490在各修整器50-1, 50-2, 50-3之離開方向的移動。Specifically, a
第一旋轉關節462安裝於凸緣484下面之中央部。手臂490從第一旋轉關節462在直線軸桿470之軸心周圍放射方向伸展。手臂490藉由第一旋轉關節462可改變角度。手臂490之前端經由球面接頭494分別安裝修整器50-1, 50-2, 50-3。藉由設置球面接頭494可將修整構件50-1a, 50-2a, 50-3a之修整面對研磨墊352平行。第二旋轉關節464設於手臂490之安裝第一旋轉關節462的端部與安裝修整器50-1, 50-2, 50-3的端部之間(中央部)。第三旋轉關節468安裝於直線軸桿470之下端部。連桿466係以連結第二旋轉關節464與第三旋轉關節468之方式設置。The first rotary joint 462 is installed at the center under the
藉由直動致動器480向上方向驅動直線軸桿470時,安裝於直線軸桿470下端部之第三旋轉關節468的位置上升,藉此,手臂490經由連桿466以向外側打開之方式角度變化。當手臂490與止動器螺栓492接觸時,如圖9所示,修整器50-1, 50-2, 50-3變成打開之狀態。所謂修整器50-1, 50-2, 50-3打開之狀態,係修整構件50-1a, 50-2a, 50-3a之修整面與研磨墊352實質地平行的狀態。在修整器50-1, 50-2, 50-3打開狀態下,藉由使用空氣汽缸53使修整器50-1, 50-2, 50-3下降,而將修整構件50-1a, 50-2a, 50-3a按壓於研磨墊352。在該狀態下,與上述實施形態(圖7及其相關說明)同樣地,藉由使研磨台350(研磨墊352)旋轉,而且藉由馬達86使修整器50-1, 50-2, 50-3旋轉,可修整(整形)研磨墊352。When the
另外,修整結束時,如圖10所示,藉由空氣汽缸53使修整器50-1, 50-2, 50-3上升。在該狀態下,藉由直動致動器480將直線軸桿470向下方向驅動時,第三旋轉關節468之位置下降,藉此,手臂490經由連桿466以向內側關閉之方式角度變化。藉此,如圖10所示,修整器50-1, 50-2, 50-3變成折疊之狀態。所謂修整器50-1, 50-2, 50-3折疊之狀態,係藉由將手臂490向內側關閉,連結修整器50-1, 50-2, 50-3最外周而形成之圓的直徑β,比在修整器50-1, 50-2, 50-3打開狀態下,連結修整器50-1, 50-2, 50-3最外周而形成之圓的直徑α小之狀態。另外,在直動致動器480之行程終點,如圖10所示,藉由修整器50-1, 50-2, 50-3變成折疊狀態可防止各修整器50-1, 50-2, 50-3接觸。In addition, at the end of the dressing, as shown in FIG. 10, the
採用本實施形態時,如圖9及圖10所示,藉由將修整器50-1, 50-2, 50-3形成打開狀態,可使用實質地大直徑之修整器50進行修整。結果,即使隨著基板WF之大型化而研磨墊352大型化,仍可在短時間進行修整,可使基板處理裝置1000之處理單元(修整單元356)的處理效率提高。In this embodiment, as shown in FIGS. 9 and 10, by opening the dressers 50-1, 50-2, and 50-3, the
再者,採用本實施形態時,在不進行修整時,如圖10所示,藉由將修整器50-1, 50-2, 50-3形成折疊狀態,可謀求基板處理裝置1000節省空間化。亦即,不進行修整時,修整單元356如圖1所示,係以退到研磨台350之外側的方式配置。在該狀態下,若修整單元356具有大直徑之修整器,為了在修整器與研磨單元300的側壁之間設指定的間隙,就需要將研磨單元300之側壁往外側擴大,而導致基板處理裝置之腳印增大。另外,採用本實施形態時,如圖10所示,藉由將修整器50-1, 50-2, 50-3形成折疊狀態而配置於研磨台350的外側,不需要將研磨單元300之側壁往外側擴大,結果,可抑制基板處理裝置1000之腳印的增大。Furthermore, in the case of this embodiment, when trimming is not performed, as shown in FIG. 10, by folding the trimmers 50-1, 50-2, and 50-3 in a folded state, the
上述經由手臂同心狀配置於旋轉軸桿之軸心周圍的複數個處理具之一例,係說明修整構件50-1a, 50-2a, 50-3a,不過不限定於此。複數個處理具亦可係用於清洗基板WF之與基板WF相對配置的清洗具。圖11係概略顯示一種實施形態之具有清洗具及折疊機構的基板處理裝置之構成的立體圖。圖12係概略顯示一種實施形態之具有清洗具及折疊機構的基板處理裝置之構成的俯視圖。An example of the plurality of treatment tools arranged concentrically around the axis of the rotating shaft through the arms described above is the trimming members 50-1a, 50-2a, and 50-3a, but it is not limited to this. The plurality of processing tools can also be cleaning tools arranged opposite to the substrate WF for cleaning the substrate WF. Fig. 11 is a perspective view schematically showing the structure of a substrate processing apparatus having a cleaning tool and a folding mechanism according to an embodiment. Fig. 12 is a plan view schematically showing the structure of a substrate processing apparatus having a cleaning tool and a folding mechanism according to an embodiment.
如圖11所示,用於基板處理裝置之清洗單元包含安裝保持藉由搬送單元所搬送之基板WF並使其旋轉的工作台10、與清洗具(碟形海綿)21之清洗具固持器27。工作台10包含安裝了水平姿勢保持基板WF之夾盤11的複數支(圖中係4支)手臂12,手臂12一體地安裝於基台13。基台13連結於旋轉軸14,基板WF可藉由旋轉軸14之旋轉而在箭頭A方向旋轉。As shown in FIG. 11, the cleaning unit used in the substrate processing apparatus includes a table 10 for mounting, holding and rotating the substrate WF transported by the transport unit, and a
此外,清洗具安裝機構20具有搖動手臂23,在搖動手臂23前端設置旋轉軸22。在旋轉軸22之下端設置與圖9及圖10同樣之折疊機構450及手臂490。在手臂490前端,取代圖9及圖10中之修整器50-1, 50-2, 50-3而設置清洗具固持器27,清洗具固持器27中安裝清洗具(碟形海綿)21。旋轉軸22藉由無圖示之旋轉機構在箭頭B方向旋轉,而使清洗具21在相同方向旋轉。此外,在搖動手臂23之後端部設置搖動軸24,可使搖動手臂23在箭頭C方向搖動。此外,搖動軸24亦使搖動手臂23如箭頭D所示地升降。In addition, the washing
在上述構成之基板處理裝置中,藉由使搖動軸24下降而使清洗具21與保持於夾盤11之基板WF接觸,在箭頭A方向旋轉之基板WF的上面,從噴嘴25噴射純水等清洗液,同時使清洗具21在箭頭B方向旋轉,並且使搖動手臂23在箭頭C方向搖動來清洗基板WF之上面。清洗結束時,使搖動手臂23回轉,而使清洗具固持器27退到基板WF之外側。In the substrate processing apparatus of the above-mentioned structure, the
如圖11所示,藉由形成打開清洗具固持器27之狀態,可使用實質地大直徑之清洗具固持器27清洗基板WF。結果,即使基板WF大型化,仍可短時間進行清洗,因此可使基板處理裝置之處理單元(清洗單元)的處理效率提高。As shown in FIG. 11, by forming a state in which the
再者,採用本實施形態時,在不進行清洗時,如圖12所示地藉由將清洗具固持器27形成折疊之狀態,可謀求基板處理裝置之節省空間化。亦即,如圖12所示,不進行清洗時,係以退到基板WF外側之方式配置清洗單元。在該狀態下,若清洗單元具有大直徑之清洗具固持器27,為了將清洗具固持器27收容於基板處理裝置,需要將基板處理裝置之側壁WL往外側擴大,而導致基板處理裝置之腳印增大。另外,採用本實施形態時,如圖12所示,藉由將清洗具固持器27形成折疊狀態,並配置於基板WF之外側,不需要將基板處理裝置之側壁WL往外側擴大,結果,可抑制基板處理裝置之腳印的增大。Furthermore, in the case of this embodiment, when the cleaning is not performed, by folding the
上述係以修整器及清洗具為例來說明複數個處理具,不過不限於此等,亦可對研磨在旋轉軸桿之軸心周圍經由手臂而同心狀配置的複數個基板之研磨單元適用本發明。亦即,在對研磨墊面朝下研磨基板之基板處理裝置中,可取代上述修整器50或清洗具固持器27而設置基板固持器,藉由在基板固持器上安裝基板WF,可有效研磨基板WF,並且可抑制基板處理裝置之腳印的增大。The above is an example of a dresser and a cleaning tool to illustrate a plurality of processing tools, but it is not limited to these, it can also be applied to a polishing unit that grinds a plurality of substrates arranged concentrically around the axis of a rotating shaft through an arm. invention. That is, in a substrate processing apparatus that grinds a substrate with the polishing pad facing down, a substrate holder can be provided instead of the
以上,係就一些本發明之實施形態作說明,不過,上述發明之實施形態係為了容易理解本發明者,而並非限定本發明者。本發明在不脫離其旨趣情況下可變更、改良,並且本發明當然包含其等效物。此外,在可解決上述問題之至少一部分的範圍,或是可達到效果之至少一部分的範圍內,申請專利範圍及說明書中記載之各元件可任意組合或省略。In the above, some embodiments of the present invention have been described. However, the above-mentioned embodiments of the present invention are intended to facilitate the understanding of the present inventors, and are not intended to limit the present inventors. The present invention can be changed and improved without departing from its gist, and of course the present invention includes its equivalents. In addition, as long as at least a part of the above-mentioned problems can be solved or at least a part of the effect can be achieved, the various elements described in the scope of the patent application and the specification can be combined or omitted arbitrarily.
本申請案之一種實施形態揭示一種處理單元,係用於基板處理裝置,且包含:旋轉軸桿,其係與基板或用於研磨基板之研磨墊相對而配置;複數個固持器,其係保持在前述旋轉軸桿之軸心周圍經由手臂而同心狀配置的複數個處理具或複數個處理對象物;驅動部,其係將前述複數個固持器在對前述基板或前述研磨墊靠近或離開之方向驅動;及折疊機構,其係以前述複數個固持器分別靠近之方式可調整前述手臂的角度而構成。An embodiment of the present application discloses a processing unit used in a substrate processing device, and includes: a rotating shaft, which is arranged opposite to the substrate or the polishing pad used for polishing the substrate; and a plurality of holders, which hold A plurality of treatment tools or a plurality of treatment objects are arranged concentrically around the axis of the rotating shaft through an arm; a driving part that moves the plurality of holders closer to or away from the substrate or the polishing pad Directional drive; and a folding mechanism, which is constituted by adjusting the angle of the arm in a manner in which the plurality of holders are approached respectively.
再者,本申請案之一種實施形態揭示一種處理單元,其中前述折疊機構包含:蝸輪,其係安裝於前述手臂;蝸桿,其係與其前述蝸輪嚙合;及旋轉致動器,其係用於旋轉驅動前述蝸桿。Furthermore, one embodiment of the present application discloses a processing unit, wherein the aforementioned folding mechanism includes: a worm gear, which is mounted on the aforementioned arm; a worm gear, which is meshed with the aforementioned worm wheel; and a rotary actuator, which is used to rotate Drive the aforementioned worm.
再者,本申請案之一種實施形態揭示一種處理單元,其中前述折疊機構包含:第一旋轉關節,其係設於前述手臂之端部;第二旋轉關節,其係設於前述手臂之中央部;連桿,其係連接於前述第二旋轉關節;第三旋轉關節,其係設於前述連桿之端部;直線軸桿,其係安裝前述第三旋轉關節;及直動致動器,其係使前述直線軸桿往返運動。Furthermore, an embodiment of the present application discloses a processing unit, wherein the aforementioned folding mechanism includes: a first revolute joint, which is set at the end of the arm; a second revolute joint, which is located at the center of the arm A connecting rod, which is connected to the aforementioned second rotary joint; a third rotary joint, which is arranged at the end of the aforementioned connecting rod; a linear shaft, which is installed with the aforementioned third rotary joint; and a linear actuator, It makes the aforementioned linear shaft move back and forth.
再者,本申請案之一種實施形態揭示一種處理單元,其中進一步包含止動器,其係藉由與前述手臂接觸,來管制前述手臂在前述複數個固持器分別離開之方向移動。Furthermore, an embodiment of the present application discloses a processing unit, which further includes a stopper, which controls the movement of the arm in the direction away from the plurality of holders by contacting the arm.
再者,本申請案之一種實施形態揭示一種處理單元,其中前述複數個處理具係為了修整前述研磨墊而與前述研磨墊相對配置之修整構件、或是為了清洗前述基板而與前述基板相對配置之清洗具的其中一個,且前述複數個處理對象物係與前述研磨墊相對配置之基板。Furthermore, an embodiment of the present application discloses a processing unit, wherein the plurality of processing tools are dressing members arranged opposite to the polishing pad in order to dress the polishing pad, or arranged opposite to the substrate in order to clean the substrate One of the cleaning tools, and the plurality of processing objects are substrates arranged opposite to the polishing pad.
再者,本申請案之一種實施形態揭示一種基板處理裝置,係包含:搬送單元,其係用於搬送基板;工作台,其係保持基板或用於研磨基板之研磨墊;及上述任何一個處理單元,其係與前述基板或前述研磨墊相對設置。Furthermore, an embodiment of the present application discloses a substrate processing apparatus, which includes: a conveying unit for conveying a substrate; a worktable for holding a substrate or a polishing pad for polishing a substrate; and any of the above processes The unit is arranged opposite to the aforementioned substrate or the aforementioned polishing pad.
10:工作台 11:夾盤 12:手臂 13:基台 14:旋轉軸 18:上方環形轉盤軸桿 21:清洗具(碟形海綿) 22:旋轉軸 23:搖動手臂 24:搖動軸 25:噴嘴 27:清洗具固持器 28:橋接器 29:支撐台 32:滾珠螺桿 32a:螺絲軸 32b:螺帽 38:伺服馬達 50,50-1,50-2,50-3:修整器(修整構件固持器) 50a,50-1a,50-2a,50-3a:修整構件 51:修整器軸桿 53:空氣汽缸(驅動部) 54:負載傳感器 55:搖動手臂 56:支柱 57:支撐台 58:支軸 60:變位感測器 61:目標板 70:測距感測器 72:球花鍵 74:軸承 76:殼體 78:旋轉接頭 82:修整器側齒輪 84:馬達側齒輪 86:馬達 88:減速機 100:裝載單元 130:支柱 200,200A,200B:搬送單元 202:搬送軋輥 204:軋輥軸桿 284:清洗噴嘴 300,300A,300B:研磨單元 302:上方環形轉盤 319:上下運動機構 321:軸承 323:旋轉接頭 350:研磨台 351:台軸桿 352:研磨墊 352a:研磨面 353:通路 354:研磨液供給噴嘴 355:開口部 356:修整單元 357:貫穿孔 358:霧化器 360:搖動手臂 362:支軸 319:上下運動機構 410:手臂 410a:第一手臂 410b:第二手臂 412:止動螺栓 414:旋轉關節 416:球面接頭 418:凸緣 420:蝸桿 422:軸承 430:蝸輪 440:旋轉致動器 442:殼體 450:折疊機構 462:第一旋轉關節 464:第二旋轉關節 466:連桿 468:第三旋轉關節 470:直線軸桿 480:直動致動器 482:殼體 484:凸緣 490:手臂 492:止動器螺栓(止動器) 494:球面接頭 500:乾燥單元 530:噴嘴 600:卸載單元 900:控制裝置 1000:基板處理裝置 A,B,C,D:箭頭 WF:基板 WL:側壁10: Workbench 11: Chuck 12: arm 13: Abutment 14: Rotation axis 18: Upper ring turntable shaft 21: Cleaning tool (dish-shaped sponge) 22: Rotation axis 23: Shake the arm 24: Shake the axis 25: Nozzle 27: Washing tool holder 28: Bridge 29: support table 32: Ball screw 32a: Screw shaft 32b: Nut 38: Servo motor 50,50-1,50-2,50-3: dresser (retainer for dressing member) 50a, 50-1a, 50-2a, 50-3a: trim parts 51: Dresser shaft 53: Air cylinder (drive part) 54: Load sensor 55: Shake the arm 56: Pillar 57: support table 58: Pivot 60: displacement sensor 61: target board 70: Ranging sensor 72: ball spline 74: Bearing 76: shell 78: Rotary joint 82: Dresser side gear 84: Motor side gear 86: Motor 88: reducer 100: loading unit 130: Pillar 200, 200A, 200B: transfer unit 202: Conveying rolls 204: Roll Axle 284: Cleaning nozzle 300, 300A, 300B: Grinding unit 302: upper ring turntable 319: Up and down movement mechanism 321: Bearing 323: Rotary joint 350: Grinding table 351: table shaft 352: Grinding Pad 352a: Grinding surface 353: Path 354: Grinding liquid supply nozzle 355: opening 356: Trimming Unit 357: Through Hole 358: Atomizer 360: Shake the arm 362: Pivot 319: Up and down movement mechanism 410: arm 410a: First arm 410b: second arm 412: Stop Bolt 414: Rotary Joint 416: Spherical joint 418: Flange 420: Worm 422: Bearing 430: Worm Gear 440: Rotary Actuator 442: Shell 450: Folding mechanism 462: First Rotary Joint 464: Second Rotary Joint 466: connecting rod 468: Third Rotary Joint 470: Linear shaft 480: Direct Actuator 482: Shell 484: Flange 490: arm 492: Stopper bolt (stopper) 494: Spherical joint 500: Drying unit 530: Nozzle 600: unload unit 900: control device 1000: Substrate processing device A, B, C, D: arrow WF: substrate WL: sidewall
圖1係顯示一種實施形態之基板處理裝置的整體構成之俯視圖。 圖2係概略顯示一種實施形態之研磨單元的構成之立體圖。 圖3係概略顯示一種實施形態之修整單元的構成之縱剖面圖。 圖4係概略顯示一種實施形態之修整器及折疊機構的構成之俯視圖。 圖5係概略顯示一種實施形態之修整器及折疊機構的構成之縱剖面圖,且顯示打開修整器之狀態。 圖6係概略顯示一種實施形態之修整器及折疊機構的構成之縱剖面圖,且顯示折疊修整器之狀態。 圖7係概略顯示使用一種實施形態之修整單元進行修整情形的俯視圖。 圖8係概略顯示一種實施形態之修整器及折疊機構的構成之俯視圖。 圖9係概略顯示一種實施形態之修整器及折疊機構的構成之縱剖面圖,且顯示打開修整器之狀態。 圖10係概略顯示一種實施形態之修整器及折疊機構的構成之縱剖面圖,且顯示折疊修整器之狀態。 圖11係概略顯示一種實施形態之清洗具及折疊機構的構成之立體圖。 圖12係概略顯示一種實施形態之清洗具及折疊機構的構成之俯視圖。FIG. 1 is a plan view showing the overall structure of a substrate processing apparatus according to an embodiment. Fig. 2 is a perspective view schematically showing the structure of a polishing unit according to an embodiment. Fig. 3 is a longitudinal sectional view schematically showing the configuration of a dressing unit of an embodiment. Fig. 4 is a plan view schematically showing the configuration of a dresser and a folding mechanism of an embodiment. Fig. 5 is a longitudinal cross-sectional view schematically showing the configuration of the dresser and the folding mechanism of an embodiment, and shows the state of opening the dresser. Fig. 6 is a longitudinal sectional view schematically showing the configuration of the dresser and folding mechanism of an embodiment, and shows the state of the folding dresser. Fig. 7 is a plan view schematically showing a condition of dressing using a dressing unit of an embodiment. Fig. 8 is a plan view schematically showing the configuration of a dresser and a folding mechanism of an embodiment. Fig. 9 is a longitudinal sectional view schematically showing the configuration of the dresser and the folding mechanism of an embodiment, and shows the state of the dresser being opened. Fig. 10 is a longitudinal sectional view schematically showing the configuration of the dresser and folding mechanism of an embodiment, and shows the state of the folding dresser. Fig. 11 is a perspective view schematically showing the construction of a cleaning tool and a folding mechanism of an embodiment. Fig. 12 is a plan view schematically showing the construction of a cleaning tool and a folding mechanism of an embodiment.
50-1,50-2:修整器 50-1, 50-2: Dresser
50-1a,50-2a:修整構件 50-1a, 50-2a: finishing components
51:修整器軸桿 51: Dresser shaft
55:搖動手臂 55: Shake the arm
350:研磨台 350: Grinding table
352:研磨墊 352: Grinding Pad
410:手臂 410: arm
410a:第一手臂 410a: First arm
410b:第二手臂 410b: second arm
412:止動螺栓 412: Stop Bolt
414:旋轉關節 414: Rotary Joint
416:球面接頭 416: Spherical joint
418:凸緣 418: Flange
420:蝸桿 420: Worm
422:軸承 422: Bearing
430:蝸輪 430: Worm Gear
440:旋轉致動器 440: Rotary Actuator
442:殼體 442: Shell
450:折疊機構 450: Folding mechanism
Claims (6)
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JP2019222928A JP2021091039A (en) | 2019-12-10 | 2019-12-10 | Processing unit and substrate treatment apparatus |
JP2019-222928 | 2019-12-10 |
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TW202124098A true TW202124098A (en) | 2021-07-01 |
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TW109141274A TW202124098A (en) | 2019-12-10 | 2020-11-25 | Processing unit and substrate processing device |
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TW (1) | TW202124098A (en) |
WO (1) | WO2021117324A1 (en) |
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JPH07130692A (en) * | 1993-10-29 | 1995-05-19 | Disco Abrasive Syst Ltd | Surface grinder |
US5989103A (en) * | 1997-09-19 | 1999-11-23 | Applied Materials, Inc. | Magnetic carrier head for chemical mechanical polishing |
JP2000070875A (en) * | 1998-08-28 | 2000-03-07 | Dainippon Screen Mfg Co Ltd | Base cleaning apparatus and base cleaning |
JP2004106084A (en) * | 2002-09-17 | 2004-04-08 | Ebara Corp | Polishing device and substrate machining device |
JP2005136068A (en) * | 2003-10-29 | 2005-05-26 | Seiko Epson Corp | Cleaning station and method for manufacturing semiconductor device |
JP6357260B2 (en) * | 2016-09-30 | 2018-07-11 | 株式会社荏原製作所 | Polishing apparatus and polishing method |
JP7244250B2 (en) * | 2017-12-26 | 2023-03-22 | 株式会社荏原製作所 | Magnetic element and eddy current sensor using it |
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