TW202109456A - Method of two-dimensional fringe-encoded pattern projection for instantaneous profile measurements - Google Patents

Method of two-dimensional fringe-encoded pattern projection for instantaneous profile measurements Download PDF

Info

Publication number
TW202109456A
TW202109456A TW108129268A TW108129268A TW202109456A TW 202109456 A TW202109456 A TW 202109456A TW 108129268 A TW108129268 A TW 108129268A TW 108129268 A TW108129268 A TW 108129268A TW 202109456 A TW202109456 A TW 202109456A
Authority
TW
Taiwan
Prior art keywords
phase
image
fringe
projection
instantaneous
Prior art date
Application number
TW108129268A
Other languages
Chinese (zh)
Other versions
TWI719588B (en
Inventor
蘇威宏
Original Assignee
國立中山大學
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 國立中山大學 filed Critical 國立中山大學
Priority to TW108129268A priority Critical patent/TWI719588B/en
Application granted granted Critical
Publication of TWI719588B publication Critical patent/TWI719588B/en
Publication of TW202109456A publication Critical patent/TW202109456A/en

Links

Images

Landscapes

  • Length Measuring Devices By Optical Means (AREA)

Abstract

A method of two-dimensional fringe-encoded pattern projection for instantaneous profile measurements is provided. The method comprises a projection step, an image capture step, a transform step, and an unwrapping step. By adopting a 2D fringe-encoded pattern with fourier transform profilometry, even if the surface color or reflectivity varies rapidly with positions, the2D fringe-encoded pattern can still distinguish the fringe order very well.

Description

適用於瞬時形貌量測二維編碼條紋投影的方法Method suitable for instantaneous shape measurement of two-dimensional coded fringe projection

本發明係關於一種測量方法,特別是關於一種適用於瞬時形貌量測二維編碼條紋投影的方法。The present invention relates to a measurement method, in particular to a method suitable for instantaneous topography measurement of two-dimensional coded fringe projection.

目前適用於動態物體的形貌量測技術,多是以結構光投影,或條紋投影技術,搭配single-shottechniques為主。主要量測原理,是將一張穿透率呈弦狀分佈的圖案,投影在動態之待測物體上,該待測物體表面的條紋分佈,則由另一視角上的CCD所紀錄。CCD所擷取的條紋分佈,將隨著物體輪廓而扭曲,故條紋的相位扭曲程度與該待測物體的深度變化有關,稱為「相位-縱深」的關係式(phase-to-depth relation),找到此關係式即可進一步得到動態之待測物體表面的三維座標。另外,表面出現深度斷層的待測物體,無法純粹從影像上識別其條紋順序(fringe order),於是又發展出條紋編碼的方式,以識別該條紋順序,進而達到相位展開(phaseunwrapping)的目的。At present, the topography measurement technology suitable for dynamic objects is mostly structured light projection or fringe projection technology, combined with single-shottechniques. The main measurement principle is to project a pattern with a string-like transmittance on a dynamic object to be measured, and the stripe distribution on the surface of the object to be measured is recorded by a CCD in another viewing angle. The fringe distribution captured by the CCD will be distorted with the contour of the object, so the degree of phase distortion of the fringe is related to the depth change of the object to be measured, which is called the "phase-to-depth relation" , Find this relational expression to further obtain the dynamic three-dimensional coordinates of the surface of the object to be measured. In addition, the object to be measured with a deep fault on the surface cannot be identified purely from the image, so the fringe order has been developed to identify the fringe order and achieve the purpose of phase unwrapping.

然而,條紋編碼的方式,容易受到外在環境的干擾,例如,照明不佳或反射率太低而導致過低的訊噪比,不僅在擷取條紋相位時,容易造成誤差,在進行條紋解碼時,也會造成灰階上的誤判,進而造成相位展開的誤差。However, the fringe encoding method is susceptible to interference from the external environment. For example, poor lighting or low reflectivity leads to a low signal-to-noise ratio. Not only does it cause errors when capturing the fringe phase, it is easy to cause errors when performing fringe decoding. At this time, it will also cause misjudgment on the gray scale, and then cause the error of phase unwrapping.

因此,有必要提供一種適用於瞬時形貌量測二維編碼條紋投影的方法,以解決上述習用技術所存在的問題。Therefore, it is necessary to provide a method suitable for instantaneous topography measurement of two-dimensional coded fringe projection to solve the problems of the above-mentioned conventional technology.

本發明之主要目的在於提供一種適用於瞬時形貌量測二維編碼條紋投影的方法,利用二維條紋編碼圖案配合傅立葉轉換的方式,即使表面顏色或反射率隨位置快速變化,二維條紋編碼圖案也能很好地區分條紋順序。The main purpose of the present invention is to provide a method suitable for instantaneous topography measurement of two-dimensional coded fringe projection, using two-dimensional fringe coding pattern with Fourier transform, even if the surface color or reflectivity changes rapidly with position, two-dimensional fringe coding The pattern can also distinguish the order of the stripes very well.

為達上述之目的,本發明提供一種適用於瞬時形貌量測二維編碼條紋投影的方法,該方法包括一投影步驟、一取像步驟、一轉換步驟及一展開步驟;在該投影步驟中,將一個二維條紋編碼圖案從一第一視角投影至一動態待測物上,使得該動態待測物的一表面形成有一投影條紋;在該取像步驟中,利用一圖像擷取裝置從一第二視角拍攝該投影條紋而擷取為一圖像;在該轉換步驟中,先沿著一水平方向對該圖像進行一第一次相位提取,以獲得一第一相位圖,再沿著該第一相位圖的等相位線方向對該圖像進行一第二次相位提取,以獲得一第二相位圖;在該展開步驟中,對該第二相位圖行進行四進制解碼,以識別第一相位圖的條紋順序,進而達到展開第一相位圖的目的,再由相位及縱深的一關係式,獲得該動態待測物的一輪廓。In order to achieve the above objective, the present invention provides a method suitable for instantaneous topography measurement of two-dimensional coded fringe projection. The method includes a projection step, an imaging step, a conversion step, and an expansion step; in the projection step , Projecting a two-dimensional stripe coding pattern from a first viewing angle onto a dynamic object to be measured, so that a projection stripe is formed on a surface of the dynamic object to be measured; in the image capturing step, an image capturing device is used The projection fringe is captured from a second angle of view and captured as an image; in the conversion step, a first phase extraction is performed on the image along a horizontal direction to obtain a first phase image, and then Perform a second phase extraction on the image along the isophase line direction of the first phase image to obtain a second phase image; in the expansion step, perform quaternary decoding on the second phase image line , In order to identify the fringe sequence of the first phase image, and then achieve the purpose of unfolding the first phase image, and then obtain a contour of the dynamic object under test based on the relationship between the phase and the depth.

在本發明之一實施例中,該圖像擷取裝置為一圖像傳感器陣列。In an embodiment of the present invention, the image capture device is an image sensor array.

在本發明之一實施例中,在該取像步驟中,沿該圖像的一圖像行獲得的灰度可以表示為:

Figure 02_image001
; 其中yo 是常數值,a (x ,y )是背景強度,b (x ,y )是調製幅度,d 是該圖像擷取裝置獲得的該的周期。In an embodiment of the present invention, in the image capturing step, the gray scale obtained along an image line of the image can be expressed as:
Figure 02_image001
; Where y o is a constant value, a ( x , y ) is the background intensity, b ( x , y ) is the modulation amplitude, and d is the period obtained by the image capturing device.

在本發明之一實施例中,該二維條紋編碼圖案配置用以提供多個附加資訊,該等附加資訊包含四進制數的數字流、條紋順序及條紋總數。In an embodiment of the present invention, the two-dimensional stripe coding pattern is configured to provide a plurality of additional information, and the additional information includes a digital stream of quaternary numbers, a stripe sequence, and a total number of stripes.

在本發明之一實施例中,該第一視角及該第二視角形成一銳角。In an embodiment of the present invention, the first viewing angle and the second viewing angle form an acute angle.

在本發明之一實施例中,在該轉換步驟中,利用傅立葉轉換對該圖像沿著一水平方向進行該第一次相位提取,以獲得水平方向的相位分佈的該第一相位圖。In an embodiment of the present invention, in the conversion step, the first phase extraction is performed on the image along a horizontal direction using Fourier transform to obtain the first phase map of the phase distribution in the horizontal direction.

在本發明之一實施例中,在該轉換步驟中,利用傅立葉轉換對該圖像沿著該第一相位圖的等相位線方向進行該第二次相位提取,以獲得沿著等相位線方向相位分佈的該第二相位圖。In an embodiment of the present invention, in the conversion step, Fourier transform is used to perform the second phase extraction on the image along the isophase line direction of the first phase map to obtain the direction along the isophase line This second phase map of the phase distribution.

在本發明之一實施例中,在該轉換步驟中,使用以下的公式進行水平方向的第一次相位提取:

Figure 02_image003
Figure 02_image005
Figure 02_image007
。In an embodiment of the present invention, in the conversion step, the following formula is used to perform the first phase extraction in the horizontal direction:
Figure 02_image003
Figure 02_image005
Figure 02_image007
.

在本發明之一實施例中,在該轉換步驟中,使用以下的公式進行第一相位圖之等相位線方向的第二次相位提取:

Figure 02_image009
Figure 02_image011
Figure 02_image013
。In an embodiment of the present invention, in the conversion step, the following formula is used to perform the second phase extraction in the isophase line direction of the first phase map:
Figure 02_image009
Figure 02_image011
Figure 02_image013
.

在本發明之一實施例中,在該投影步驟中,該二維條紋編碼圖案的透射率可以表示為:

Figure 02_image015
; 其中m 是描繪四進制數的腳註,To 是邊緣週期,r 是量化比率。In an embodiment of the present invention, in the projection step, the transmittance of the two-dimensional fringe code pattern can be expressed as:
Figure 02_image015
; Where m is a footnote describing a quaternary number, T o is the fringe period, and r is the quantization ratio.

在本發明之一實施例中,該量化比率r 定義為: 若四進制數m=0,則r =1.00; 若四進制數m=1,則r =1.33; 若四進制數m=2,則r =1.67;及 若四進制數m=3,則r =2.00。In an embodiment of the present invention, the quantization ratio r is defined as: if the quaternary number m=0, then r =1.00; if the quaternary number m=1, then r =1.33; if the quaternary number m =2, then r =1.67; and if the quaternary number m=3, then r =2.00.

如上所述,本發明適用於瞬時形貌量測二維編碼條紋投影的方法提出利用二維條紋編碼圖案配合傅立葉轉換的方式,其中用於相位提取的條紋圖案可以直接用於展開,不需要為相位展開採取額外的預測,因而能夠精準識別條紋順序(fringe order)而達到相位展開(phaseunwrapping)的目的。另外,利用二維條紋編碼圖案的設計,其演算法簡單且可靠度佳,即使表面顏色或反射率隨位置快速變化,二維條紋編碼圖案也能很好地區分條紋順序,適用於大部分的動態物體,並且同時能夠測量多個或色彩複雜的物體。As mentioned above, the method of the present invention suitable for instantaneous topography measurement of two-dimensional coded fringe projection proposes the use of two-dimensional fringe coding pattern with Fourier transform, wherein the fringe pattern used for phase extraction can be directly used for unfolding without The phase unwrapping adopts additional predictions, so that the fringe order can be accurately identified to achieve the purpose of phase unwrapping. In addition, the design of the two-dimensional stripe coding pattern is simple and reliable. Even if the surface color or reflectivity changes rapidly with the position, the two-dimensional stripe coding pattern can distinguish the stripe sequence well, which is suitable for most of the Dynamic objects, and can measure multiple or complex color objects at the same time.

為了讓本發明之上述及其他目的、特徵、優點能更明顯易懂,下文將特舉本發明較佳實施例,並配合所附圖式,作詳細說明如下。再者,本發明所提到的方向用語,例如上、下、頂、底、前、後、左、右、內、外、側面、周圍、中央、水平、橫向、垂直、縱向、軸向、徑向、最上層或最下層等,僅是參考附加圖式的方向。因此,使用的方向用語是用以說明及理解本發明,而非用以限制本發明。In order to make the above and other objectives, features, and advantages of the present invention more obvious and understandable, the preferred embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings. Furthermore, the directional terms mentioned in the present invention, such as up, down, top, bottom, front, back, left, right, inside, outside, side, surrounding, center, horizontal, horizontal, vertical, vertical, axial, The radial direction, the uppermost layer or the lowermost layer, etc., are only the direction of reference to the attached drawings. Therefore, the directional terms used are used to describe and understand the present invention, rather than to limit the present invention.

請參照第1圖所示,為本發明適用於瞬時形貌量測二維編碼條紋投影的方法的一較佳實施例,該方法包括一投影步驟S201、一取像步驟S202、一轉換步驟S203及一展開步驟S204。本發明將於下文詳細說明各步驟的關係及其運作原理。Please refer to Fig. 1, which is a preferred embodiment of the method for instantaneous topography measurement of two-dimensional coded fringe projection according to the present invention. The method includes a projection step S201, an image capturing step S202, and a conversion step S203. And an unfolding step S204. The present invention will describe in detail the relationship between the steps and the principle of operation below.

請參照第1及2圖所示,在該投影步驟S201中,將一個二維條紋編碼圖案從一第一視角沿著一斜線方向L1投影至一動態待測物101上,使得該動態待測物的一表面形成有一投影條紋102,其中第2圖為條紋投影系統的光學配置。其中L1表示的公式1為:

Figure 02_image017
;Referring to Figures 1 and 2, in the projection step S201, a two-dimensional stripe code pattern is projected from a first viewing angle along an oblique line direction L1 onto a dynamic test object 101, so that the dynamic test object 101 is A projection stripe 102 is formed on one surface of the object, and Figure 2 is the optical configuration of the stripe projection system. The formula 1 represented by L1 is:
Figure 02_image017

在本實施例中,本發明適用於瞬時形貌量測二維編碼條紋投影的方法是提出一種用於輪廓測量的一次性技術,將該二維條紋編碼圖案照射在該動態待測物101上,其中該二維條紋編碼圖案配置用以提供多個附加資訊,該等附加資訊包含四進制數的數字流、條紋順序及條紋總數。In this embodiment, the method of the present invention suitable for instantaneous profile measurement of two-dimensional coded fringe projection is to propose a one-time technique for profile measurement, and irradiate the two-dimensional coded pattern on the dynamic object 101 under test. , Wherein the two-dimensional stripe coding pattern is configured to provide a plurality of additional information, and the additional information includes a quaternary number stream, a stripe sequence and a total number of stripes.

請參照第1及2圖所示,在該取像步驟S202中,利用一圖像擷取裝置從一第二視角拍攝該投影條紋而擷取為一圖像;在本實施例中,該圖像擷取裝置為一圖像傳感器陣列,採用單色照相以該第二視角觀察該圖像的變形條紋,其中該第一視角及該第二視角形成一銳角。進一步來說,沿該圖像的一圖像行獲得的灰度可以表示為:

Figure 02_image019
;Please refer to FIGS. 1 and 2. In the image capturing step S202, an image capturing device is used to capture the projection fringe from a second angle of view to capture an image; in this embodiment, the image The image capturing device is an image sensor array that uses monochrome photography to observe the deformed fringes of the image at the second viewing angle, wherein the first viewing angle and the second viewing angle form an acute angle. Furthermore, the gray scale obtained along an image line of the image can be expressed as:
Figure 02_image019

其中yo 是常數值,a (x ,y )是背景強度,b (x ,y )是調製幅度,d 是該圖像擷取裝置獲得的該的周期。Where y o is a constant value, a ( x , y ) is the background intensity, b ( x , y ) is the modulation amplitude, and d is the period obtained by the image capturing device.

請參照第1圖所示,在該轉換步驟S203中,沿著水平的方向對該圖像進行第一次的相位提取(phase extration),以獲得一第一相位圖,再利用傅立葉轉換對該圖像沿著第一相位圖之等相位線方向進行第二次的相位提取,以獲得沿著等相位線方向相位分佈的一第二相位圖;在本實施例中,利用傅立葉轉換對該圖像沿著一水平方向進行第一次相位提取,以獲得水平方向相位分佈的相位圖,再利用傅立葉轉換對該圖像的多個圖像行沿著第一相位圖之等相位線方向進行第二次相位提取,以獲得等相位線方向(本實施例恰好是垂直方向)相位分佈的相位圖。Please refer to Figure 1, in the conversion step S203, the first phase extraction (phase extration) of the image is performed along the horizontal direction to obtain a first phase image, and then the Fourier transform is used to obtain a first phase image. The image is subjected to the second phase extraction along the isophase line direction of the first phase image to obtain a second phase image of the phase distribution along the isophase line direction; in this embodiment, Fourier transform is used for the image The first phase extraction is performed on the image along a horizontal direction to obtain a phase map of the phase distribution in the horizontal direction, and then Fourier transform is used to perform the first phase extraction along the isophase line direction of the first phase map for multiple image lines of the image. The second phase extraction is performed to obtain a phase map of the phase distribution in the isophase line direction (this embodiment happens to be the vertical direction).

要說明的是,傅立葉轉換是一種眾所周知的三維形狀測量方法,因為具有全場測量能力,如非接觸式檢測及一次性檢測,可將該二維條紋編碼圖案投影到該動態待測物101上,並從該第二視角擷取該圖像,並紀錄該圖像的條紋分佈。其中該圖像的相位被該動態待測物101的表面輪廓扭曲,因此可以透過分析來檢索三圍形狀,並且為了獲得該圖像的相位分佈,係採用相移算法,通過反正切運算來評估相位,導致在區間(–   )中約束的原理值,因此需要透過展開(unwrapping)來恢復相位圖的連續性。It should be noted that Fourier transform is a well-known three-dimensional shape measurement method, because it has full-field measurement capabilities, such as non-contact detection and one-time detection, and the two-dimensional stripe code pattern can be projected onto the dynamic test object 101 , And capture the image from the second angle of view, and record the stripe distribution of the image. The phase of the image is distorted by the surface contour of the dynamic test object 101, so the three-dimensional shape can be retrieved through analysis, and in order to obtain the phase distribution of the image, a phase shift algorithm is used to evaluate the phase through arctangent calculation , Resulting in the interval (– , ). Therefore, it is necessary to restore the continuity of the phase map through unwrapping.

進一步來說,公式1關於x軸(水平方向)的一維傅立葉轉換表示的公式2為:

Figure 02_image021
;Furthermore, the formula 2 expressed by the one-dimensional Fourier transform of formula 1 on the x-axis (horizontal direction) is:
Figure 02_image021

另外,基本分量的逆傅立葉轉換表示的公式3為:

Figure 02_image023
;In addition, the formula 3 expressed by the inverse Fourier transform of the fundamental components is:
Figure 02_image023

其中可以使用公式4來提取相位:

Figure 02_image025
;Which can use formula 4 to extract the phase:
Figure 02_image025

要注意的是,公式4使用反正切函数來計算相位,導致分佈包含2  ,因此需要展開以產生連續的相位分佈。It should be noted that formula 4 uses the arctangent function to calculate the phase, resulting in the distribution containing 2 , So it needs to be expanded to produce a continuous phase distribution.

進一步來說,使用以下的公式進行第一相位圖之等相位線方向的第二次相位提取:

Figure 02_image027
Figure 02_image029
Figure 02_image031
。Furthermore, use the following formula to perform the second phase extraction in the isophase line direction of the first phase map:
Figure 02_image027
Figure 02_image029
Figure 02_image031
.

請參照第3圖所示,為編碼模式的示例,顯示二維條紋編碼圖案的外觀,並且在下面標記了四進制數的數字流,其中該二維條紋編碼圖案的透射率在數學上可描述表示為公式5:

Figure 02_image033
;Please refer to Figure 3, which is an example of the coding mode, showing the appearance of the two-dimensional stripe coding pattern, and the digital stream of quaternary numbers is marked below, where the transmittance of the two-dimensional stripe coding pattern can be mathematically The description is expressed as Formula 5:
Figure 02_image033

其中m 是描繪四進制數的腳註,To 是邊緣週期,r 是量化比率,而且該量化比率r 定義為公式6: 若四進制數m=0,則r =1.00; 若四進制數m=1,則r =1.33; 若四進制數m=2,則r =1.67;及 若四進制數m=3,則r =2.00。Where m is a footnote depicting a quaternary number, T o is a fringe period, r is a quantization ratio, and the quantization ratio r is defined as Formula 6: If the quaternary number m=0, then r = 1.00; if the quaternary number m=0, then r=1.00; If the number m=1, then r =1.33; if the quaternary number m=2, then r =1.67; and if the quaternary number m=3, then r =2.00.

通過組裝所有編碼條紋(encoded fringes)所形成的整個圖案,表示為公式7:

Figure 02_image035
;The entire pattern formed by assembling all encoded fringes is expressed as formula 7:
Figure 02_image035

其中n是條紋順序,N是條紋的總數,四進制數m隨著條紋順序而改變,如第3圖所示,在條紋下方尋找四進制數的數字流。Where n is the stripe sequence, N is the total number of stripes, and the quaternary number m changes with the stripe sequence. As shown in Figure 3, look for the quaternary number stream under the stripe.

如第4a圖所示,是透過組裝64個密碼字形成的四進制數的數字流,任何密碼字在後續的數字中都是唯一的。因此,可以識別條紋順序。另外,如第4b圖所示,列出帶有四進制數的條紋順序的列表。例如,後續數字2,3及0形成密碼字27(見圖3),並用於標記範圍從27到29的條紋順序,其中以四進制數表示的條紋順序(fringe orders),四進制數以獨特的方式進行置換,條紋順序可以被任何三個相鄰的數字識別。對於包含3個四進制數的密碼字,有64個排列,即43 = 64。因此可以產生66個數字流。64個密碼字可以通過以下方式在空間上重疊:一個密碼字與另一個密碼字部分重疊,並且兩個數字在兩個密碼字之間重疊。由於僅在整個數字流中發生一次,因此識別出相應的3個條紋。其他密碼字也僅出現一次。因此,可以清楚地識別所有的條紋順序。As shown in Figure 4a, it is a digital stream of quaternary numbers formed by assembling 64 cipher words. Any cipher word is unique among subsequent digits. Therefore, the stripe sequence can be recognized. In addition, as shown in Figure 4b, a list of stripe sequences with quaternary numbers is listed. For example, the subsequent digits 2, 3, and 0 form the password 27 (see Figure 3), and are used to mark the fringe order ranging from 27 to 29. The fringe orders represented by quaternary numbers are quaternary numbers. Replaced in a unique way, the stripe sequence can be identified by any three adjacent numbers. For a password containing 3 quaternary numbers, there are 64 permutations, that is, 4 3 = 64. Therefore, 66 digital streams can be generated. 64 cipher words can overlap spatially by the following way: one cipher word partially overlaps another cipher word, and two numbers overlap between the two cipher words. Since it only occurs once in the entire digital stream, the corresponding 3 stripes are identified. Other passwords only appear once. Therefore, all fringe sequences can be clearly recognized.

請參照第1圖所示,在該展開步驟S204中,將該相位圖進行展開,並且將該相位圖對應的每一個圖像行進行解碼,以獲得該待測物的一輪廓。進一步來說,條紋解碼是一項任務,可以使用四進制數指定投影條紋,從而可以識別條紋順序。例如,如第5a圖所示,為平面上的投影二維圖案,其顯示投射到平坦表面上的條紋的外觀。如第5b圖所示,為沿x軸的一維相位分佈,可以利用公式4來提取沿x軸的相位分佈 x (即第一相位圖  (x ,yo )),其中等相位線被定義為由具有相同相位值 x 的像素所組裝的線。如第5c圖所示,為沿等相位線的一維相位分佈  ( equal ,y ),其通過沿著等相位線線的方向提取投影二維圖案的相位來顯示相位圖(即第二相位圖  ( equal ,y ))。其中量化比率r可以通過公式8來識別:

Figure 02_image037
;Referring to FIG. 1, in the expansion step S204, the phase map is expanded, and each image line corresponding to the phase map is decoded to obtain an outline of the object under test. Furthermore, fringe decoding is a task, and projection fringes can be specified using quaternary numbers, so that the order of fringes can be identified. For example, as shown in Figure 5a, it is a projected two-dimensional pattern on a plane, which shows the appearance of stripes projected on a flat surface. As shown in Figure 5b, it is the one-dimensional phase distribution along the x-axis. Formula 4 can be used to extract the phase distribution x along the x-axis (that is, the first phase image ( x , y o )), where isophase lines are defined as lines assembled by pixels with the same phase value x. As shown in Figure 5c, it is a one-dimensional phase distribution along the isophase line ( equal , y ), which displays the phase map (ie, the second phase map) by extracting the phase of the projected two-dimensional pattern along the direction of the isophase line ( equal , y )). The quantization ratio r can be identified by formula 8:
Figure 02_image037

其中Td 是沿x軸的條紋周期(為已知值);因此,參考公式6可以執行四進制數,既然數字流中的任何三個後續數字都是唯一的並且沒有出現在其他地方,則可以使用第4b圖所示的列表來識別所有條紋順序,然後以條紋順序執行相位展開,如公式9所示:

Figure 02_image039
;Where T d is the stripe period along the x-axis (a known value); therefore, quaternary numbers can be executed by referring to Equation 6, since any three subsequent digits in the digital stream are unique and do not appear elsewhere, Then you can use the list shown in Figure 4b to identify all fringe orders, and then perform phase unwrapping in the fringe order, as shown in Equation 9:
Figure 02_image039

其中  是由公式4所獲得的覆蓋相位(wrapped phase),n是條紋順序。Wherein the phase is covered (wrapped phase) obtained by the formula 4, n is the fringe order.

進一步來說,可以選擇在一紙盒上定位的一個球體作為一待測物,如第6圖所示,為使用編碼條紋進行投影至待測物而進行圖像擷取的外觀,利用公式4中描述的方法提取投影的編碼條紋的相位。然後,通過沿等相線方向提取投影的編碼條紋的相位來獲得相位圖,接著利用公式8為每個條紋計算量化比率,因而為每個圖像行產生三位元數的數字流。然後,利用查找上述的列表來進行展開,並對每個圖像行重複解碼過程,因而展開整個相位圖,以獲得如第7圖所示,該待測物為球體的輪廓。Furthermore, a sphere positioned on a carton can be selected as an object to be measured. As shown in Figure 6, to use coded stripes to project to the object to be measured for the appearance of image capture, formula 4 The method described in extracts the phase of the projected code fringe. Then, the phase map is obtained by extracting the phase of the projected code fringe along the isophase line, and then the quantization ratio is calculated for each fringe using Equation 8, thereby generating a three-digit digital stream for each image line. Then, the expansion is performed by searching the above-mentioned list, and the decoding process is repeated for each image line, thereby expanding the entire phase map to obtain the outline of the sphere as shown in Figure 7.

如上所述,本發明適用於瞬時形貌量測二維編碼條紋投影的方法提出利用二維條紋編碼圖案配合傅立葉轉換的方式,其中用於相位提取的條紋圖案可以直接用於展開,不需要為相位展開採取額外的預測,因而能夠精準識別條紋順序(fringe order)而達到相位展開(phase unwrapping)的目的,同時克服照明不佳或反射率太低而導致過低的訊噪比而容易造成誤差的問題,以及克服在進行條紋解碼因灰階上的誤判而導致相位展開誤差的問題。另外,利用二維條紋編碼圖案的設計,其演算法簡單且可靠度佳,即使表面顏色或反射率隨位置快速變化,二維條紋編碼圖案也能很好地區分條紋順序,適用於大部分的動態物體,並且同時能夠測量多個或色彩複雜的物體。As mentioned above, the method of the present invention suitable for instantaneous topography measurement of two-dimensional coded fringe projection proposes the use of two-dimensional fringe coding pattern with Fourier transform, wherein the fringe pattern used for phase extraction can be directly used for unfolding without Phase unwrapping adopts additional predictions, so it can accurately identify fringe order to achieve phase unwrapping, and at the same time overcome poor illumination or low reflectivity, which leads to low signal-to-noise ratio, which is easy to cause errors. It also overcomes the problem of phase unwrapping errors caused by misjudgment on gray scale during fringe decoding. In addition, the design of the two-dimensional stripe coding pattern is simple and reliable. Even if the surface color or reflectivity changes rapidly with the position, the two-dimensional stripe coding pattern can distinguish the stripe sequence well, which is suitable for most of the Dynamic objects, and can measure multiple or complex color objects at the same time.

雖然本發明已以較佳實施例揭露,然其並非用以限制本發明,任何熟習此項技藝之人士,在不脫離本發明之精神和範圍內,當可作各種更動與修飾,因此本發明之保護範圍當視後附之申請專利範圍所界定者為準。Although the present invention has been disclosed in preferred embodiments, it is not intended to limit the present invention. Anyone familiar with the art can make various changes and modifications without departing from the spirit and scope of the present invention. Therefore, the present invention The scope of protection shall be subject to the scope of the attached patent application.

S201:投影步驟 S202:取像步驟 S203:轉換步驟 S204:展開步驟 L1:斜線方向 101:動態待測物 102:投影條紋S201: Projection step S202: image acquisition step S203: Conversion step S204: unfolding steps L1: diagonal direction 101: Dynamic DUT 102: Projection fringe

第1圖是根據本發明適用於瞬時形貌量測二維編碼條紋投影的方法的一較佳實施例的一流程圖。 第2圖是根據本發明適用於瞬時形貌量測二維編碼條紋投影的方法的一較佳實施例投影二維條紋編碼圖案的一示意圖。 第3圖是根據本發明適用於瞬時形貌量測二維編碼條紋投影的方法的一較佳實施例的二維條紋編碼圖案的一示意圖。 第4a圖是根據本發明適用於瞬時形貌量測二維編碼條紋投影的方法的一較佳實施例的四進制數的數字流。 第4b圖是根據本發明適用於瞬時形貌量測二維編碼條紋投影的方法的一較佳實施例的四進制數的條紋順序的一列表。 第5a圖是根據本發明適用於瞬時形貌量測二維編碼條紋投影的方法的一較佳實施例在平面上的投影二維圖案的一示意圖。 第5b圖是根據本發明適用於瞬時形貌量測二維編碼條紋投影的方法的一較佳實施例沿x軸的一維相位分佈的一示意圖(第一相位圖)。 第5c圖是根據本發明適用於瞬時形貌量測二維編碼條紋投影的方法的一較佳實施例沿等相位線的一維相位分佈的一示意圖(第二相位圖)。 第6圖是根據本發明適用於瞬時形貌量測二維編碼條紋投影的方法的一較佳實施例使用編碼條紋進行投影至動態待測物而進行圖像擷取的一示意圖。 第7圖是根據本發明適用於瞬時形貌量測二維編碼條紋投影的方法的一較佳實施例的動態待測物的輪廓的一示意圖。FIG. 1 is a flowchart of a preferred embodiment of the method for instantaneous topography measurement of two-dimensional coded fringe projection according to the present invention. FIG. 2 is a schematic diagram of projecting a two-dimensional coded fringe pattern according to a preferred embodiment of the method for instantaneous topography measurement of the two-dimensional coded fringe projection according to the present invention. FIG. 3 is a schematic diagram of a two-dimensional fringe encoding pattern according to a preferred embodiment of the method for instantaneous topography measurement of the two-dimensional encoding fringe projection according to the present invention. Fig. 4a is a digital stream of quaternary numbers according to a preferred embodiment of the method for instantaneous topography measurement of two-dimensional coded fringe projection according to the present invention. FIG. 4b is a list of the quaternary number fringe sequence of a preferred embodiment of the method for instantaneous topography measurement of the two-dimensional code fringe projection according to the present invention. FIG. 5a is a schematic diagram of the projection of a two-dimensional pattern on a plane according to a preferred embodiment of the method for instantaneous topography measurement of the two-dimensional coded fringe projection according to the present invention. Fig. 5b is a schematic diagram of a one-dimensional phase distribution along the x-axis of a preferred embodiment of the method for instantaneous topography measurement of two-dimensional coded fringe projection according to the present invention (the first phase diagram). Figure 5c is a schematic diagram (second phase map) of the one-dimensional phase distribution along the isophase line according to a preferred embodiment of the method for instantaneous topography measurement of the two-dimensional coded fringe projection according to the present invention. FIG. 6 is a schematic diagram of a preferred embodiment of the method for instantaneous topography measurement of the two-dimensional coded fringe projection according to the present invention, which uses the coded fringe to project to the dynamic object to be measured for image capture. FIG. 7 is a schematic diagram of the contour of the dynamic object to be measured according to a preferred embodiment of the method for instantaneous topography measurement of the two-dimensional coded fringe projection according to the present invention.

S201:投影步驟 S201: Projection step

S202:取像步驟 S202: image acquisition step

S203:轉換步驟 S203: Conversion step

S204:展開步驟 S204: unfolding steps

Claims (10)

一種適用於瞬時形貌量測二維編碼條紋投影的方法,該方法包括: 一投影步驟,將一個二維條紋編碼圖案從一第一視角投影至一動態待測物上,使得該動態待測物的一表面形成有一投影條紋; 一取像步驟,利用一圖像擷取裝置從一第二視角拍攝該投影條紋而擷取為一圖像; 一轉換步驟,先沿著一水平方向對該圖像進行一第一次相位提取,以獲得一第一相位圖,再沿著該第一相位圖的等相位線方向對該圖像進行一第二次相位提取,以獲得一第二相位圖;及 一展開步驟,對該第二相位圖行進行四進制解碼,以識別第一相位圖的條紋順序,進而達到展開第一相位圖的目的,再由相位及縱深的一關係式,獲得該動態待測物的一輪廓。A method suitable for instantaneous topography measurement of two-dimensional coded fringe projection, the method includes: A projection step, projecting a two-dimensional stripe code pattern from a first viewing angle onto a dynamic object to be measured, so that a projection stripe is formed on a surface of the dynamic object to be measured; In an image capturing step, an image capturing device is used to capture the projection fringe from a second angle of view to capture an image; In a conversion step, a first phase extraction is performed on the image along a horizontal direction to obtain a first phase map, and then a first phase extraction is performed on the image along the isophase line direction of the first phase map. Secondary phase extraction to obtain a second phase map; and In an expansion step, quaternary decoding is performed on the second phase map row to identify the fringe sequence of the first phase map, and then achieve the purpose of expanding the first phase map, and then obtain the dynamics from the relationship between phase and depth An outline of the object to be measured. 如申請專利範圍第1項所述之適用於瞬時形貌量測二維編碼條紋投影的方法,其中該圖像擷取裝置為一圖像傳感器陣列。As described in item 1 of the scope of patent application, the method suitable for instantaneous topography measurement of two-dimensional coded fringe projection, wherein the image capturing device is an image sensor array. 如申請專利範圍第1項所述之適用於瞬時形貌量測二維編碼條紋投影的方法,其中在該取像步驟中,沿該圖像的一圖像行獲得的灰度可以表示為:
Figure 03_image041
; 其中yo 是常數值,a (x ,y )是背景強度,b (x ,y )是調製幅度,d 是該圖像擷取裝置獲得的該的周期。
As described in item 1 of the scope of patent application, the method suitable for instantaneous topography measurement of two-dimensional coded fringe projection, wherein in the image capturing step, the gray scale obtained along an image line of the image can be expressed as:
Figure 03_image041
; Where y o is a constant value, a ( x , y ) is the background intensity, b ( x , y ) is the modulation amplitude, and d is the period obtained by the image capturing device.
如申請專利範圍第1項所述之適用於瞬時形貌量測二維編碼條紋投影的方法,其中該二維條紋編碼圖案配置用以提供多個附加資訊,該等附加資訊包含四進制數的數字流、條紋順序及條紋總數。As described in item 1 of the scope of patent application, the method suitable for instantaneous topography measurement of two-dimensional coded fringe projection, wherein the two-dimensional coded pattern is configured to provide a plurality of additional information, and the additional information includes quaternary numbers The number stream, the sequence of stripes, and the total number of stripes. 如申請專利範圍第1項所述之適用於瞬時形貌量測二維編碼條紋投影的方法,其中該第一視角及該第二視角形成一銳角。As described in item 1 of the scope of patent application, the method suitable for instantaneous topography measurement of two-dimensional coded fringe projection, wherein the first viewing angle and the second viewing angle form an acute angle. 如申請專利範圍第1項所述之適用於瞬時形貌量測二維編碼條紋投影的方法,其中在該轉換步驟中,利用傅立葉轉換對該圖像沿著該水平方向進行該第一次相位提取,以獲得水平方向的相位分佈的該第一相位圖。As described in item 1 of the scope of patent application, the method suitable for instantaneous topography measurement of two-dimensional coded fringe projection, wherein in the conversion step, Fourier transform is used to perform the first phase of the image along the horizontal direction. Extracting to obtain the first phase map of the phase distribution in the horizontal direction. 如申請專利範圍第1項所述之適用於瞬時形貌量測二維編碼條紋投影的方法,其中在該轉換步驟中,利用傅立葉轉換對該圖像沿著該第一相位圖的等相位線方向進行該第二次相位提取,以獲得沿著等相位線方向相位分佈的該第二相位圖。As described in the first item of the scope of patent application, the method suitable for instantaneous topography measurement of two-dimensional coded fringe projection, wherein in the conversion step, Fourier transform is used to follow the isophase line of the first phase image to the image The second phase extraction is performed in the direction to obtain the second phase map of the phase distribution along the isophase line direction. 如申請專利範圍第1項所述之適用於瞬時形貌量測二維編碼條紋投影的方法,其中在該轉換步驟中,使用以下的公式進行水平方向的第一次相位提取:
Figure 03_image043
Figure 03_image045
Figure 03_image047
As described in the first item of the scope of patent application, the method suitable for instantaneous topography measurement of two-dimensional coded fringe projection, wherein in the conversion step, the following formula is used for the first phase extraction in the horizontal direction:
Figure 03_image043
Figure 03_image045
Figure 03_image047
.
如申請專利範圍第1項所述之適用於瞬時形貌量測二維編碼條紋投影的方法,其中在該轉換步驟中,使用以下的公式進行第一相位圖之等相位線方向的第二次相位提取:
Figure 03_image049
Figure 03_image051
Figure 03_image053
As described in the first item of the scope of patent application, the method suitable for instantaneous topography measurement of two-dimensional coded fringe projection, wherein in the conversion step, the following formula is used to perform the second time of the isophase line direction of the first phase image Phase extraction:
Figure 03_image049
Figure 03_image051
Figure 03_image053
.
如申請專利範圍第1項所述之適用於瞬時形貌量測二維編碼條紋投影的方法,其中在該投影步驟中,該二維條紋編碼圖案的透射率可以表示為:
Figure 03_image055
; 其中m 是描繪四進制數的腳註,To 是邊緣週期,r 是量化比率。
As described in item 1 of the scope of patent application, the method suitable for instantaneous topography measurement of two-dimensional coded fringe projection, wherein in the projection step, the transmittance of the two-dimensional coded fringe pattern can be expressed as:
Figure 03_image055
; Where m is a footnote describing a quaternary number, T o is the fringe period, and r is the quantization ratio.
TW108129268A 2019-08-16 2019-08-16 Method of two-dimensional fringe-encoded pattern projection for instantaneous profile measurements TWI719588B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW108129268A TWI719588B (en) 2019-08-16 2019-08-16 Method of two-dimensional fringe-encoded pattern projection for instantaneous profile measurements

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW108129268A TWI719588B (en) 2019-08-16 2019-08-16 Method of two-dimensional fringe-encoded pattern projection for instantaneous profile measurements

Publications (2)

Publication Number Publication Date
TWI719588B TWI719588B (en) 2021-02-21
TW202109456A true TW202109456A (en) 2021-03-01

Family

ID=75745866

Family Applications (1)

Application Number Title Priority Date Filing Date
TW108129268A TWI719588B (en) 2019-08-16 2019-08-16 Method of two-dimensional fringe-encoded pattern projection for instantaneous profile measurements

Country Status (1)

Country Link
TW (1) TWI719588B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI837061B (en) * 2023-09-06 2024-03-21 國立中山大學 System and method for 3d profile measurements using color fringe projection techniques

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI422999B (en) * 2006-10-26 2014-01-11 Seereal Technologies Sa Holographic display device, manufacturing method thereof and method of generating holographic reconstruction
TWI409502B (en) * 2009-01-23 2013-09-21 Univ Nat Taipei Technology Method for acquiring phase information and system for measuring three dimensional surface shape
US20130173484A1 (en) * 2010-09-18 2013-07-04 Philip Wesby System and Method for Encoding and Controlled Authentication
TWI471522B (en) * 2013-07-25 2015-02-01 Nat Univ Tsing Hua The system and method for measuring the surface topography of transparent materials with phase-shifting shadow moire method
TWI583920B (en) * 2015-12-29 2017-05-21 國立中山大學 Measuring system of specular object and measuring method thereof

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI837061B (en) * 2023-09-06 2024-03-21 國立中山大學 System and method for 3d profile measurements using color fringe projection techniques

Also Published As

Publication number Publication date
TWI719588B (en) 2021-02-21

Similar Documents

Publication Publication Date Title
Salvi et al. A state of the art in structured light patterns for surface profilometry
Lin et al. Three-dimensional shape measurement technique for shiny surfaces by adaptive pixel-wise projection intensity adjustment
Feng et al. Fast three-dimensional measurements for dynamic scenes with shiny surfaces
US10584963B2 (en) System and methods for shape measurement using dual frequency fringe pattern
JP5317169B2 (en) Image processing apparatus, image processing method, and program
CN109253708A (en) A kind of fringe projection time phase method of deploying based on deep learning
CN206583415U (en) Determine the system, surface analysis equipment and system of the uniformity of reflecting surface
CN107798698B (en) Structured light stripe center extraction method based on gray correction and adaptive threshold
CN109341589A (en) A kind of raster image projecting method, three-dimensional rebuilding method and three-dimensional reconstruction system
CN104596439A (en) Speckle matching and three-dimensional measuring method based on phase information aiding
CN111998800B (en) Three-dimensional surface shape measuring method and system based on speckle embedded stripe
CN108955571A (en) The method for three-dimensional measurement that double frequency heterodyne is combined with phase-shift coding
CN103033147A (en) Structured light 3-dimensional measurement device and measurement method thereof
CN105157614B (en) Method for three-dimensional measurement based on two-value phase-shift pattern
Petković et al. Single-shot dense 3D reconstruction using self-equalizing De Bruijn sequence
Lv et al. An improved phase-coding method for absolute phase retrieval based on the path-following algorithm
TWI719588B (en) Method of two-dimensional fringe-encoded pattern projection for instantaneous profile measurements
CN113345039B (en) Three-dimensional reconstruction quantization structure optical phase image coding method
Law et al. Deep learning based period order detection in structured light three-dimensional scanning
CN105698708A (en) Three-dimensional visual sense reconstruction method
KR101001894B1 (en) Apparatus and method for 3-D profilometry using color projection moire technique
US10801834B2 (en) Fringe projection for determining topography of a body
Wu et al. Two-neighbor-wavelength phase-shifting approach for high-accuracy rapid 3D measurement
CN114166150A (en) Stripe reflection three-dimensional measurement method, system and storage medium
Gorthi et al. A new approach for simple and rapid shape measurement of objects with surface discontinuities