CN105157614B - Method for three-dimensional measurement based on two-value phase-shift pattern - Google Patents
Method for three-dimensional measurement based on two-value phase-shift pattern Download PDFInfo
- Publication number
- CN105157614B CN105157614B CN201510301362.9A CN201510301362A CN105157614B CN 105157614 B CN105157614 B CN 105157614B CN 201510301362 A CN201510301362 A CN 201510301362A CN 105157614 B CN105157614 B CN 105157614B
- Authority
- CN
- China
- Prior art keywords
- phase
- pattern
- shift
- frequency
- value
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Abstract
The invention discloses a kind of method for three-dimensional measurement based on two-value phase-shift pattern.Use the projector equipment and camera device focused, with projector equipment the two-value pattern sequence that multigroup use space square wave is encoded is projected to testee, every group of pattern has a particular space frequency, the spatial frequency of one of which pattern is 1, there is fixed phase drift amount between adjacent patterns in every group of pattern, total phase-shift phase is a cycle, corresponding image sequence is recorded with camera device, the phase calculation formula of phase measuring profilometer is respectively applied to the image sets of different frequency, obtain base Ld phase and multiple high frequencies block phase, absolute phase is obtained according to time phase method of deploying, the three-dimensional coordinate on testee surface is determined according to phase and system calibrating parameter.The present invention can be used for high-speed, high precision three-dimensional measurement.The present invention has without gamma correction, sweep speed be fast, system calibrating is simple, can accurate measurement of depth change the advantage of scene greatly.
Description
Technical field
The present invention relates to optical triangle method technology, more particularly to by projecting binary-coding pattern to object body surface
The three-dimensional measurement in face.
Background technology
At present, structural light measurement technology is the mainstream technology that high-precision three-dimensional is rebuild.Wherein, phase measuring profilometer
（Phase Measuring Profilometry, abbreviation PMP）It is a kind of classical structural light three-dimensional measurement method, with measurement
Precision is high, the advantage insensitive to the disturbing factor such as ambient light and testee texture.PMP uses the sinusoidal structured with phase shift
Light pattern sequence, calculates phase, and pass through the three-dimensional on phase information acquisition testee surface using the image sequence captured
Coordinate.However, PMP has the disadvantage that, firstly, since PMP is using sinusoidal greyscale pattern, mission nonlinear will cause measurement to miss
Difference, in order to reduce the error, it is necessary to carry out cumbersome gamma correction；Secondly, the frame of current projection two-value pattern
Rate is significantly larger than the frame per second of projection gray level pattern, and PMP uses greyscale pattern, therefore its sweep speed is restricted, and is unfavorable for reality
When three-dimensional measurement.In order to overcome PMP disadvantages mentioned above, paper " Lei S, Zhang S. Flexible 3-D shape
measurement using projector defocusing[J]. Optics Letters, 2009, 34(20):
3080-3082 " describes the defocus measuring method based on two-value pattern, and this method is substituted in PMP just with two-value phase-shift pattern
String phase-shift pattern, is distributed by making the brightness of seizure image meet near sinusoidal to projector equipment defocus, finally uses phase measurement
The phase calculation formula of technology of profiling obtains phase.But the existing defocus measuring method based on two-value pattern sets projection due to needing
Standby defocus, has the disadvantage that：1）The reduced dynamic range of projection brightness, causes the signal to noise ratio reduction for catching image；2）After defocus
Conventional scaling method, the complexity increase of system calibrating can not be used.3）Change of this method to testee depth is sensitive.
How can play that two-value pattern sweep speed is fast, the advantage without gamma correction, again projector equipment defocus can be overcome to bring
Shortcoming, can just solve this key technical problem using the scheme that refers to of the present invention.
The content of the invention
The present invention is for the defocus measuring method signal noise ratio (snr) of image based on two-value pattern is low, system calibrating is complicated, to depth
Change sensitive defect, propose a kind of method for three-dimensional measurement based on two-value phase-shift pattern, this method need not make projector equipment from
Jiao, so drawbacks described above caused by defocus can not only be overcome, also inherit two-value pattern sweep speed it is fast, without gamma correction
Advantage.
The purpose of the present invention is realized using following technical proposals：
Using the projector equipment and camera device focused, space square wave is used to testee projection is multigroup with projector equipment
The two-value pattern sequence of coding, every group of pattern has a particular space frequency, and the spatial frequency of one of which pattern is 1, often
There is fixed phase drift amount in group pattern between adjacent patterns, total phase-shift phase is a cycle, is recorded with camera device corresponding
The phase calculation formula of phase measuring profilometer, is respectively applied to the image of different frequency, obtains base Ld phase by image sequence
Phase is blocked with multiple high frequencies, absolute phase is obtained according to time phase method of deploying, it is true according to phase and system calibrating parameter
Determine the three-dimensional coordinate on testee surface.
The present invention has the following advantages compared with prior art：
Because the present invention uses two-value pattern, it can realize that high speed three-dimensional is measured, and without gamma correction.Meanwhile, by
In the present invention without defocus, compared with the existing defocus measuring method based on two-value pattern, higher signal to noise ratio, system can be reached
Demarcation is simpler, can the scene of accurate measurement of depth change greatly.
Brief description of the drawings
Fig. 1 is the workflow diagram of the method for three-dimensional measurement of the invention based on two-value phase-shift pattern.
Embodiment
The device of use has 1 CASIO XJ-M140 projector, and projector's caching frame sign isPixel, ash
Metrization grade is 8bit；1 Prosilica GC650 industry camera, resolution ratio isPixel, grey level quantization
Grade is 8bit.1 computer with Core i3 3530 CPU, 4GB internal memories, by computer to structured light projection and shooting
Process is controlled.Accompanying drawing 1 is the workflow diagram of method for three-dimensional measurement of the present embodiment based on two-value phase-shift pattern.This example
Specific implementation step is as follows：
（1）Camera and projector are focused, it is accurately focused.
（2）Camera and projector are demarcated, respectively obtain camera is with projector sizeProjection square
Battle array、。
（3）Generate two-value phase-shift pattern.Two-value phase-shift pattern is generated by sinusoidal phase-shift pattern.Sinusoidal phase-shift pattern can be with
It is expressed as：
（1）
Wherein,Exist for sinusoidal phase-shift patternThe gray value at place, fFor the spatial frequency of pattern,
The height in projector space is represented, NFor phase shift total step number,nFor phase coefficient,WithFor constant, meet.This
The parameter of example sinusoidal structured light pattern is, phase shift sumN=40, spatially frequency be divided into 5 groups, each group
The spatial frequency of pattern takes respectivelyf=1、2、10、32、64.The formula for being converted to two-value pattern from sinusoidal pattern is：
（2）
Wherein,Represent that two-value phase-shift pattern existsThe gray value at place.
（4）Structure light scan is carried out to target object.With projector above-mentioned 5 groups of structured light patterns sequencesThrow successively
Target object surface is mapped to, and shooting is synchronized to target scene with a camera.The structure light image sequence photographed
It is expressed as,, whereinCamera space coordinate is represented, expression phase coefficient is n
Camera image in pixelThe gray value at place.
（5）With the structure light image photographedDecoding obtains phase.Calculate phase formula be：
（3）
Formula（3）The shooting image group with different frequency is respectively applied to, base Ld phase is calculated and not deployed
High-frequency phase, then passage time phase unwrapping method high-frequency phase is deployed successively with base Ld phase, finally give expansion
Accurate phase afterwards.The specific method of multifrequency phase expansion is in technical report " Yalla V G, Hassebrook L G. Very
high resolution 3D surface scanning using multi-frequency phase measuring
profilometry[C]//Defense and Security. International Society for Optics and
Photonics, 2005:It is discussed in detail in 44-53 ".
（6）According to phase and system calibrating parameterWithThe three-dimensional seat on testee surface can be calculated
Mark.Circular is in paper " Li J, Hassebrook L G, Guan C. Optimized two-frequency
phase-measuring-profilometry light-sensor temporal-noise sensitivity[J]. JOSA
A, 2003, 20(1):106-115. " in be discussed in detail.
The foregoing is merely illustrative of the preferred embodiments of the present invention, is not intended to limit the invention, all essences in the present invention
Any modifications, equivalent substitutions and improvements made within refreshing and principle etc., should be included in the scope of the protection.
Claims (1)
1. a kind of method for three-dimensional measurement based on two-value phase-shift pattern, it is characterised in that use the projector equipment and shooting focused
Device, projects two-value phase-shift pattern sequence, pattern is encoded with space periodic square-wave signal with projector equipment to testee,
Pattern has two intensity levels, is minimum brightness and the maximum brightness of projector, and pattern sequence is divided into multigroup, and every group of pattern has
One particular space frequency, the spatial frequency of one of which pattern is there is fixed phase drift between adjacent patterns in 1, every group of pattern
Amount, total phase-shift phase is a cycle, and phase shift number of times is at least 3, corresponding image sequence is recorded with camera device, is surveyed with phase
The phase calculation formula of amount technology of profiling obtains the phase of image sequence, i.e., the phase calculation formula of phase measuring profilometer is distinguished
Applied to the image of different frequency, obtain base Ld phase and multiple high frequencies block phase, obtained according to time phase method of deploying
Absolute phase, the purpose of these operations is using high-frequency phase suppression phase error is deployed, so as to obtain the phase of pinpoint accuracy
Information, the three-dimensional coordinate on testee surface is determined finally according to phase and system calibrating parameter.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510301362.9A CN105157614B (en) | 2015-06-05 | 2015-06-05 | Method for three-dimensional measurement based on two-value phase-shift pattern |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510301362.9A CN105157614B (en) | 2015-06-05 | 2015-06-05 | Method for three-dimensional measurement based on two-value phase-shift pattern |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN105157614A CN105157614A (en) | 2015-12-16 |
| CN105157614B true CN105157614B (en) | 2017-11-07 |
Family
ID=54798558
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510301362.9A Active CN105157614B (en) | 2015-06-05 | 2015-06-05 | Method for three-dimensional measurement based on two-value phase-shift pattern |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN105157614B (en) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108645354B (en) * | 2018-07-06 | 2019-10-18 | 四川大学 | The structured light three-dimensional imaging method and system of high reflective subject surface |
| TWI676781B (en) * | 2018-08-17 | 2019-11-11 | 鑑微科技股份有限公司 | Three-dimensional scanning system |
| CN109029294B (en) * | 2018-08-21 | 2020-09-01 | 合肥工业大学 | Fast gray stripe synthesis method based on focusing binary pattern |
| CN110108230B (en) * | 2019-05-06 | 2021-04-16 | 南京理工大学 | Binary grating projection defocus degree evaluation method based on image difference and LM iteration |
| CN111141232A (en) * | 2019-12-20 | 2020-05-12 | 浙江大学 | High-quality binary stripe generation method based on multi-objective optimization dithering algorithm |
| CN113983960B (en) * | 2021-10-12 | 2023-10-31 | 安徽农业大学 | Multi-frequency fringe projection nonlinear error correction method |
| CN114923437B (en) * | 2022-05-19 | 2023-09-26 | 四川大学 | Three-dimensional measurement method and device based on defocused binary square wave fringes |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103983208A (en) * | 2014-05-09 | 2014-08-13 | 南昌航空大学 | Out-of-focus projection three-dimensional measurement method of color binary fringes |
| CN104457614A (en) * | 2014-11-11 | 2015-03-25 | 南昌航空大学 | Stripe reflection three-dimensional measurement method based on binary stripe defocusing |
| CN104567730A (en) * | 2015-01-15 | 2015-04-29 | 四川大学 | Method for generating light field with sine structure by means of space-time binary encoding |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20120176478A1 (en) * | 2011-01-11 | 2012-07-12 | Sen Wang | Forming range maps using periodic illumination patterns |
-
2015
- 2015-06-05 CN CN201510301362.9A patent/CN105157614B/en active Active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103983208A (en) * | 2014-05-09 | 2014-08-13 | 南昌航空大学 | Out-of-focus projection three-dimensional measurement method of color binary fringes |
| CN104457614A (en) * | 2014-11-11 | 2015-03-25 | 南昌航空大学 | Stripe reflection three-dimensional measurement method based on binary stripe defocusing |
| CN104567730A (en) * | 2015-01-15 | 2015-04-29 | 四川大学 | Method for generating light field with sine structure by means of space-time binary encoding |
Non-Patent Citations (3)
| Title |
|---|
| Three-dimensional profilometry with nearly focused binary phase-shifting algorithms;Laura Ekstrand等;《OPTICS LETTERS》;20111201;第36卷(第23期);第4518-4520页及图1-3 * |
| 应用计算机测量乳房基本尺寸的实验研究;查选平等;《中华整形外科杂志》;20050531;第21卷(第3期);第179页第2.3节及图1 * |
| 消除相位测量轮廓术中多路径效应的影响;杨洋等;《强激光与粒子束》;20150430;第27卷(第4期);第041013-2页第3节 * |
Also Published As
| Publication number | Publication date |
|---|---|
| CN105157614A (en) | 2015-12-16 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN105157614B (en) | Method for three-dimensional measurement based on two-value phase-shift pattern | |
| Yin et al. | High-speed three-dimensional shape measurement using geometry-constraint-based number-theoretical phase unwrapping | |
| JP7350343B2 (en) | Method and system for generating three-dimensional images of objects | |
| JP4889373B2 (en) | Three-dimensional shape measuring method and apparatus | |
| US9322643B2 (en) | Apparatus and method for 3D surface measurement | |
| CN107167093B (en) | A kind of the combined type measuring system and measurement method of laser line scanning and shadow Moire | |
| CN111145342A (en) | Binocular speckle structured light three-dimensional reconstruction method and system | |
| JP5633058B1 (en) | 3D measuring apparatus and 3D measuring method | |
| CN109506589A (en) | A kind of measuring three-dimensional profile method based on light field imaging | |
| CN104315996B (en) | The method that Fourier transform profilometry is realized with binary coding strategy | |
| US20170251197A1 (en) | Optical 3-d sensor for fast and dense shape capture | |
| CN106091986B (en) | A kind of method for three-dimensional measurement suitable for glossy surface | |
| CN110230994A (en) | The object raster image phase shift method phase measurement error bearing calibration that picture point is traced to the source | |
| KR20130032368A (en) | Three-dimensional measurement apparatus, three-dimensional measurement method, and storage medium | |
| CN107860337B (en) | Structured light three-dimensional reconstruction method and device based on array camera | |
| JP2008157797A (en) | Three-dimensional measuring method and three-dimensional shape measuring device using it | |
| JP2017116420A (en) | Data processing device and method of data processing | |
| KR20140101223A (en) | 3D measurement apparatus and method | |
| Zhang | Digital multiple wavelength phase shifting algorithm | |
| CN104200456B (en) | A kind of coding/decoding method for line-structured light three-dimensional measurement | |
| Lutzke et al. | Experimental comparison of phase-shifting fringe projection and statistical pattern projection for active triangulation systems | |
| JP2008145209A (en) | Device for measuring three-dimensional shape, and method for measuring three-dimensional shape | |
| JP4797109B2 (en) | Three-dimensional shape measuring apparatus and three-dimensional shape measuring method | |
| JP2010175554A (en) | Device and method for measuring three-dimensional shape | |
| Jia et al. | Error compensation in two-step triangular-pattern phase-shifting profilometry |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| CB03 | Change of inventor or designer information | ||
| CB03 | Change of inventor or designer information |
Inventor after: Liu Kai Inventor after: Long Yunfei Inventor after: Wu Wei Inventor after: Yang Xiaomin Inventor after: Xu Bin Inventor before: Liu Kai Inventor before: Long Yunfei Inventor before: Wu Wei Inventor before: Yang Xiaomin |
|
| GR01 | Patent grant | ||
| GR01 | Patent grant |