TW202104880A - Coaxial multi-wavelength optical component detection system including a base, a stage, an optical projection unit, an optical focusing unit, a wavefront sensing unit and a comparison unit - Google Patents

Coaxial multi-wavelength optical component detection system including a base, a stage, an optical projection unit, an optical focusing unit, a wavefront sensing unit and a comparison unit Download PDF

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TW202104880A
TW202104880A TW108126651A TW108126651A TW202104880A TW 202104880 A TW202104880 A TW 202104880A TW 108126651 A TW108126651 A TW 108126651A TW 108126651 A TW108126651 A TW 108126651A TW 202104880 A TW202104880 A TW 202104880A
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lens
wavefront
detection system
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TWI727381B (en
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許玄岳
趙元慶
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合盈光電科技股份有限公司
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Abstract

This invention relates to a coaxial multi-wavelength optical component detection system and in particular to a lens detection system for detecting the quality of a lens using a coaxial multi-frequency light source in conjunction with a wavefront detector. The coaxial multi-wavelength optical component detection system includes a base, a stage, an optical projection unit, an optical focusing unit, a wavefront sensing unit and a comparison unit, wherein the optical projection unit includes a plurality of light emitting sources and a coaxial lens. In this way, by adopting the light emitting units such as He-Ne laser, H-F laser, YAG laser or gallium aluminum arsenide and in combination with the design of the Hartmann-Shack wavefront detector serving as hardware, a wavefront graph formed by a light beam passing through the sample to be tested and entering the wavefront detector is effectively detected, and a difference of the wavefront graph and a control wavefront graph of a normal control group is compared, so that the lens detection system provided by this invention has the main advantages that the sample to be tested is effectively detected, testing time and cost are saved, and nondestructive testing purpose is achieved.

Description

同軸多波長光學元件檢測系統 Coaxial multi-wavelength optical element detection system

本發明係有關於一種同軸多波長光學元件檢測系統,尤其是指一種使用複數發光源搭配波前檢測器以檢測待測樣品光學鏡片或光學介質組合品質之良窳的檢測系統。 The present invention relates to a coaxial multi-wavelength optical element detection system, in particular to a detection system that uses a complex number of light sources with a wavefront detector to detect the quality of the optical lens or optical medium combination of the sample to be tested.

按,近年來,隨著科學技術的進步與發展,設置於光學產品內的光學鏡片應用也日益增大,例如在數位相機、智慧型手機或筆記型電腦等具有照相功能的電子設備中,都可以見到光學鏡片的長遠應用;一般來說,光學鏡片於成型後會進行相關的檢測動作,例如光軸偏移、曲率或厚度等之檢測程序,目的是要確保光學鏡片的製作品質。 According to recent years, with the advancement and development of science and technology, the application of optical lenses installed in optical products has also increased. For example, in digital cameras, smart phones, or laptops and other electronic devices with camera functions, they are all The long-term application of optical lenses can be seen; in general, after the optical lenses are formed, relevant inspection actions are carried out, such as the detection procedures of optical axis deviation, curvature or thickness, etc., in order to ensure the quality of the production of optical lenses.

在現行鏡片加工廠的鏡片相關檢測程序上,皆是使用干涉儀進行鏡片曲率之檢測,然而,干涉儀的檢測程序具有必須仰賴人工操作,以及作業時間費時等缺點,所以鏡頭加工廠僅能對鏡片進行抽檢程序,而無法達到全檢的目的;因此,如何藉由創新的硬體設計,有效檢測待測鏡片的優劣,確實達到節省鏡片檢測時間與檢測成本,仍是鏡頭檢測系統等相關產業開發業者與相關研究人員需持續努力克服與解決之課題。 In the current lens-related inspection procedures of lens processing factories, interferometers are used to detect the curvature of the lenses. However, the inspection procedures of interferometers have the disadvantages of relying on manual operation and time-consuming operation. Therefore, the lens processing factories can only check the curvature of the lenses. The lens undergoes random inspection procedures, and the purpose of full inspection cannot be achieved; therefore, how to effectively detect the pros and cons of the lens to be tested through innovative hardware design, and indeed save the time and cost of lens inspection, is still in related industries such as lens inspection systems Developers and related researchers need to continue their efforts to overcome and solve problems.

近年來,雖有開發出利用系統波前進行分析診斷鏡片曲率優劣的檢測系統,但其往往受限於長期以來,光學系統均使用在攜帶式裝備上的思維慣性;在檢測系統上也因為對於成像的好壞最終以人眼進行判 斷,所以檢測設備均以綠色雷射光進行光學元件良莠評價的基準。但自2015年以來,自動駕駛車系統已逐漸風尚成為顯學,各國都設定2022~2025全數導入自動駕駛。而車用環境在此前景下將直接連結到戶外環境,成為公眾安全系統的一部分。 In recent years, although a detection system that uses the wavefront of the system to analyze and diagnose the curvature of the lens has been developed, it is often limited by the inertia of thinking that the optical system has been used in portable equipment for a long time; The quality of imaging is ultimately judged by the human eye Therefore, the inspection equipment uses green laser light to evaluate the quality of optical components. However, since 2015, self-driving car systems have gradually become popular, and countries have set to introduce automatic driving in 2022~2025. In this prospect, the vehicle environment will be directly connected to the outdoor environment and become a part of the public safety system.

然而,車載的攝影鏡頭會隨著使用在戶外的動態環境,承受溫差、刮風下雨、熱輻射,甚至霜雪寒凍的情境,在此嚴酷情境下,車載攝影鏡頭依然需清楚忠實的成像與代替人眼智慧化判斷行車的下一步。每一天早,晨光光線由地平線的一端升起,車載攝影鏡頭在此環境下必須瞬間進行自動曝光調整對應外在強烈光源環境,夕陽時分;絢麗的光彩又水平映入車載攝影鏡頭,光從一天的開始由水平仰角朝日正當中再朝另一方向沒入黑夜中。每日周而復始卻呈現不同光的照度,顏色及明暗情境的變化,如晴、陰、雨、霾..等,自駕車載攝影鏡頭必須隨著戶外的動態光源環境進行及時應對,換句話說:車載攝影鏡頭必須在廣義範圍的波長下運作,才能符合自駕車的基本運作。 However, the vehicle-mounted camera lens will withstand temperature differences, wind and rain, heat radiation, and even frost and snow conditions as it is used in the outdoor dynamic environment. In this harsh situation, the vehicle-mounted camera lens still needs to clearly and faithfully image And instead of human eyes to intelligently judge the next step of driving. Every morning, the morning light rises from one end of the horizon. In this environment, the vehicle camera lens must instantly adjust the automatic exposure corresponding to the external strong light source environment, at sunset; the brilliant brilliance is reflected in the vehicle camera lens horizontally, and the light is from At the beginning of the day, from the horizontal elevation angle towards the middle of the sun and then into the night in the other direction. It repeats every day but presents different light illuminances, colors and changes in light and dark situations, such as sunny, overcast, rainy, haze, etc. The self-driving car camera lens must respond in time to the outdoor dynamic light source environment, in other words: The photographic lens must operate at a broad range of wavelengths to meet the basic operation of a self-driving car.

現階段車載攝影鏡頭成像品質多以相當532nm光譜的綠光雷射進行檢測,在檢測波長的覆蓋度上嚴重不足,但個別切換不同波長的發光源不但費時費力,且在檢驗設備的校正上也是不切實際的選擇。 At this stage, the imaging quality of vehicle-mounted camera lenses is mostly detected by green lasers with a spectrum equivalent to 532nm, which is seriously inadequate in the coverage of detection wavelengths. However, individual switching of light sources of different wavelengths is not only time-consuming and laborious, but also in the calibration of inspection equipment. Unrealistic choice.

今,發明人即是鑑於傳統鏡頭檢測系統於實際實施時仍存在有諸多缺失,於是乃一本孜孜不倦之精神,並藉由其豐富之專業知識及多年之實務經驗所輔佐,而加以改善,並據此研創出本發明。 Nowadays, the inventor has made improvements in view of the fact that there are still many shortcomings in the actual implementation of the traditional lens inspection system, so he has a tireless spirit and is assisted by his wealth of professional knowledge and years of practical experience. Based on this, the invention was developed.

本發明主要目的為提供一種同軸多波長光學元件檢測系 統,尤其是指一種使用複數不同的雷射光源搭配波前檢測器以待測樣品光學元件組合曲率之良窳的光學元件檢測系統,主要係藉由氦氖雷射、氫氟雷射、YAG雷射或砷化嫁鋁等發光單元結合Hartmann-Shack波前檢測器之硬體設計,有效檢測不同波長雷射光束穿透待測鏡片後進入波前檢測器所形成之波前圖形,並與正常鏡片之對照波前圖形比對之間的差異,以有效檢測待測樣品光學鏡片或光學介質組合曲率之良窳,確實達到節省檢測時間與檢測成本、實現鏡頭全檢目的,以及達成非破壞性檢測目的等主要優勢者。 The main purpose of the present invention is to provide a coaxial multi-wavelength optical element detection system System, especially refers to an optical element detection system that uses a plurality of different laser light sources and wavefront detectors to combine the curvature of the sample optical elements to be tested, mainly by helium-neon lasers, hydrogen fluorine lasers, and YAG Laser or arsenic aluminum and other light-emitting units combined with the hardware design of the Hartmann-Shack wavefront detector can effectively detect the wavefront pattern formed by the laser beam of different wavelengths after penetrating the lens under test and entering the wavefront detector. The difference between the contrast wavefront pattern comparison of the normal lens, to effectively detect the curvature of the optical lens or optical medium combination of the sample to be tested, to save the inspection time and inspection cost, to achieve the purpose of full inspection of the lens, and to achieve non-destructive The main advantages such as the purpose of sex testing.

為了達到上述之實施目的,本發明人提出一種同軸多波長光學元件檢測系統,係至少包括有一基座、一載台、一光學投射單元、一光學聚焦單元、一波前感測單元,以及一比對單元;基座係用以承載同軸多波長光學元件檢測系統;載台係設置於基座上且其中間部位係開設有一開口,其中載台係用以承載至少一待測樣品,該待測樣品可以是任意形式的光學元件;光學投射單元係設置於基座下端部,該光學投射單元係包含複數發光源以及一共軸透鏡,該複數發光源所發射之該複數不同波長之光束係經由共軸透鏡共軸化光路後朝向載台之開口處發射一光束以通過待測樣品;光學聚焦單元係包括有一設置於載台下方之第一透鏡模組,以及一設置於載台上方之第二透鏡模組,其中第一透鏡模組係將發光單元之光束聚焦於待測鏡片上,而第二透鏡模組係用以接收一穿透待測樣品之穿透光束並聚焦向上傳遞;波前感測單元係設置於第二透鏡模組之上方,波前感測單元係包括有一繞射光學元件模組,一連接該繞射光學元件模組的感光耦合元件模組以及一連接該繞射光學元件模組的感光耦合元件模組之波形產 生模組,繞射光學元件模組係接收穿透光束並形成複數個光點經感光耦合元件模組傳遞至波形產生模組,波形產生模組係接受光點以經由一轉換公式產生一波前圖形;比對單元係電性連接波前感測單元以接收波前圖形,比對單元係進行波前圖形與一內建之對照波前圖形之比對動作,當比對結果小於一閥值時,待測樣品係判定為正常。 In order to achieve the above-mentioned implementation objectives, the inventor proposes a coaxial multi-wavelength optical element detection system, which at least includes a base, a carrier, an optical projection unit, an optical focusing unit, a wavefront sensing unit, and a The comparison unit; the base is used to carry the coaxial multi-wavelength optical element detection system; the carrier is arranged on the base with an opening in its middle part, and the carrier is used to carry at least one sample to be tested. The test sample can be any form of optical element; the optical projection unit is arranged at the lower end of the base, the optical projection unit includes a plurality of light-emitting sources and a coaxial lens, and the light beams of different wavelengths emitted by the plurality of light-emitting sources pass through The coaxial lens emits a light beam toward the opening of the carrier after coaxializing the optical path to pass through the sample to be tested; the optical focusing unit includes a first lens module arranged under the carrier and a second lens module arranged above the carrier. Two lens modules, in which the first lens module focuses the light beam of the light-emitting unit on the lens to be tested, and the second lens module is used to receive a penetrating light beam that penetrates the sample to be tested and focus it upwards; The front sensing unit is arranged above the second lens module. The wavefront sensing unit includes a diffractive optical element module, a photosensitive coupling element module connected to the diffractive optical element module, and a photosensitive coupling element module connected to the diffractive optical element module. Waveform production of the photosensitive coupling element module of the optical element module The diffractive optical element module receives the penetrating light beam and forms a plurality of light spots and transmits them to the waveform generation module through the photosensitive coupling element module. The waveform generation module receives the light spots to generate a wave through a conversion formula Front pattern; the comparison unit is electrically connected to the wavefront sensing unit to receive the wavefront pattern, and the comparison unit performs a comparison action between the wavefront pattern and a built-in control wavefront pattern. When the comparison result is less than a valve Value, the sample to be tested is judged to be normal.

如上所述的同軸多波長光學元件檢測系統,其中共軸透鏡係為一多角菱形透鏡。 In the above-mentioned coaxial multi-wavelength optical element detection system, the coaxial lens is a polygonal rhombus lens.

如上所述的同軸多波長光學元件檢測系統,其中第一透鏡模組與帶測樣品間包含有一空間濾波單元,該空間濾波單元係用以過濾理想光點以外的空間雜訊並放大該光學投射單元發射之光束。 In the above-mentioned coaxial multi-wavelength optical element detection system, a spatial filter unit is included between the first lens module and the tape test sample, and the spatial filter unit is used to filter the spatial noise other than the ideal light spot and amplify the optical projection The beam emitted by the unit.

如上所述的同軸多波長光學元件檢測系統,其中該多角菱形透鏡與該複數發光源之間係進一步設有一快門裝置;該快門裝置上系設有數量係同等對應該發光源數量的快門,用以調控通過該多角菱形透鏡的光束。 In the coaxial multi-wavelength optical element detection system as described above, a shutter device is further provided between the polygonal rhombus lens and the plurality of light-emitting sources; the shutter device is provided with shutters of the same number corresponding to the number of light-emitting sources. In order to control the light beam passing through the polygonal diamond lens.

如上所述的同軸多波長光學元件檢測系統,其中載台係可進一步設置有一進料裝置,進料裝置係用以承載待測樣品。 In the above-mentioned coaxial multi-wavelength optical element detection system, the carrier system can be further provided with a feeding device, and the feeding device is used to carry the sample to be tested.

如上所述的同軸多波長光學元件檢測系統,其中進料裝置係為Tray盤、移動式載盤、固定式載盤、輸送帶或卡匣等其中之一種裝置。 In the above-mentioned coaxial multi-wavelength optical element detection system, the feeding device is one of a tray, a movable tray, a fixed tray, a conveyor belt, or a cassette.

如上所述的同軸多波長光學元件檢測系統,其中載台係可進一步設置有一移動平台。 In the coaxial multi-wavelength optical element detection system as described above, the carrier system may be further provided with a mobile platform.

如上所述的鏡片檢測系統,其中移動平台係設置有一X軸調整模組與一Y軸調整模組,X軸調整模組與Y軸調整模組係承載進料裝置以 分別進行X軸向與Y軸向之移動。 In the above-mentioned lens detection system, the mobile platform is provided with an X-axis adjustment module and a Y-axis adjustment module, and the X-axis adjustment module and the Y-axis adjustment module carry the feeding device to Move the X axis and Y axis respectively.

如上所述的鏡片檢測系統,其中載台係可進一步設置有一Z軸調整模組,Z軸調整模組係調整載台於基座上進行Z軸向之移動。 In the lens detection system as described above, the carrier system can be further provided with a Z-axis adjustment module, and the Z-axis adjustment module adjusts the carrier to move in the Z-axis on the base.

如上所述的鏡片檢測系統,其中發光單元係為一雷射裝置。 In the above-mentioned lens detection system, the light-emitting unit is a laser device.

如上所述的鏡片檢測系統,其中發光單元係為一LED裝置。 In the above-mentioned lens detection system, the light-emitting unit is an LED device.

如上所述的鏡片檢測系統,其中發光單元係為一氦氖雷射、氫氟雷射、YAG雷射或砷化嫁鋁等發光單元。 In the above-mentioned lens detection system, the light-emitting unit is a light-emitting unit such as a helium-neon laser, a hydrogen-fluorine laser, a YAG laser, or an aluminum arsenide.

如上所述的鏡片檢測系統,其中波前感測單元係為一Hartmann-Shack波前檢測器。 In the lens detection system as described above, the wavefront sensing unit is a Hartmann-Shack wavefront detector.

如上所述的鏡片檢測系統,其中轉換公式係為Zernike多項式演算法。 In the above-mentioned lens detection system, the conversion formula is Zernike polynomial algorithm.

如上所述的鏡片檢測系統,其中鏡片檢測系統係可進一步裝設於一機殼之內部,該機殼內部係不透光之材質。 In the above-mentioned lens detection system, the lens detection system can be further installed inside a casing which is made of opaque material.

藉此,本發明之鏡片檢測系統主要係藉由氦氖雷射、氫氟雷射、YAG雷射或砷化嫁鋁等發光單元,透過光源投射單元內的菱形多角透鏡將複數發光源所發射不同波長的光束同軸化,並可透過設置在菱形多角透鏡前的快門裝置調控進入該菱形多角透鏡的光束波長;結合Hartmann-Shack波前檢測器之硬體設計,有效檢測不同波長的光束穿透待測樣品後進入波前檢測器所形成之波前圖形,並與正常鏡片之對照波前圖形比對之間的差異,以有效檢測待測樣品光學元件組合曲率之良窳,確實達到節省檢測時間與檢測成本,以及達成非破壞性檢測目的等主要優勢;此外,本發明之同軸多波長光學元件檢測系統主要係結合包含複數個發光源 之光學投射單元與波前檢測器之硬體設計,可有效實現待測鏡片或待測鏡頭之檢測時間小於1.5秒之需求,確實達到全檢之目的,以有效節省檢測時間與縮短製程時間之主要優勢。 In this way, the lens detection system of the present invention mainly uses light-emitting units such as He-Ne lasers, hydrogen-fluorine lasers, YAG lasers or arsenic aluminum to emit multiple light-emitting sources through the diamond-shaped polygonal lens in the light source projection unit. The beams of different wavelengths are coaxial, and the wavelength of the beam entering the rhombus polygonal lens can be adjusted through the shutter device arranged in front of the rhombus polygonal lens; combined with the hardware design of the Hartmann-Shack wavefront detector, it can effectively detect the penetration of the beams of different wavelengths The sample to be tested enters the wavefront pattern formed by the wavefront detector, and compares the difference between the wavefront pattern with the control wavefront pattern of the normal lens, so as to effectively detect the curvature of the optical element combination of the sample to be tested, and it does save testing. The main advantages of time and inspection cost, as well as achieving the purpose of non-destructive inspection; in addition, the coaxial multi-wavelength optical element inspection system of the present invention mainly combines multiple light-emitting sources The hardware design of the optical projection unit and the wavefront detector can effectively achieve the requirement that the inspection time of the lens to be tested or the lens to be tested is less than 1.5 seconds, and it does achieve the goal of full inspection, so as to effectively save the inspection time and shorten the process time. The main advantage.

(1)‧‧‧同軸多波長光學元件檢測系統 (1)‧‧‧Coaxial multi-wavelength optical component detection system

(2)‧‧‧待測樣品 (2)‧‧‧Sample to be tested

(11)‧‧‧基座 (11)‧‧‧Base

(12)‧‧‧載台 (12)‧‧‧Carrier

(121)‧‧‧進料裝置 (121)‧‧‧Feeding device

(122)‧‧‧移動平台 (122)‧‧‧Mobile Platform

(1221)‧‧‧X軸調整模組 (1221)‧‧‧X-axis adjustment module

(1222)‧‧‧Y軸調整模組 (1222)‧‧‧Y-axis adjustment module

(123)‧‧‧Z軸調整模組 (123)‧‧‧Z axis adjustment module

(13)‧‧‧光學投射單元 (13)‧‧‧Optical projection unit

(131)‧‧‧複數發光單元 (131)‧‧‧Multiple light-emitting units

(132)‧‧‧快門模組 (132)‧‧‧Shutter Module

(133)‧‧‧共軸透鏡 (133)‧‧‧Coaxial lens

(14)‧‧‧光學聚焦單元 (14)‧‧‧Optical Focus Unit

(141)‧‧‧第一透鏡模組 (141)‧‧‧The first lens module

(142)‧‧‧第二透鏡模組 (142)‧‧‧Second lens module

(143)‧‧‧空間濾波單元 (143)‧‧‧Spatial Filter Unit

(15)‧‧‧波前感測單元 (15)‧‧‧Wavefront sensing unit

(16)‧‧‧顯示單元 (16)‧‧‧Display unit

(3)‧‧‧機殼 (3)‧‧‧Chassis

第1圖:本發明同軸多波長光學元件檢測系統其一較佳實施例之整體架構立體圖 Figure 1: A perspective view of the overall structure of a preferred embodiment of the coaxial multi-wavelength optical component inspection system of the present invention

第2圖:本發明同軸多波長光學元件檢測系統其一較佳實施例之整體架構側視圖 Figure 2: A side view of the overall architecture of a preferred embodiment of the coaxial multi-wavelength optical component inspection system of the present invention

第3圖:本發明同軸多波長光學元件檢測系統其一交佳實施例之複數發光源與菱形透鏡同軸光路設計示意圖。 Figure 3: A schematic diagram of the coaxial optical path design of the complex light source and the rhombic lens in a preferred embodiment of the coaxial multi-wavelength optical element detection system of the present invention.

第4圖:本發明同軸多波長光學元件檢測系統其一較佳實施例之機殼與顯示單元架設示意圖 Figure 4: A schematic diagram of the chassis and display unit of a preferred embodiment of the coaxial multi-wavelength optical element detection system of the present invention

為利 貴審查委員瞭解本發明之技術特徵、內容、優點,以及其所能達成之功效,茲將本發明配合附圖,並以實施例之表達形式詳細說明如下,而其中所使用之圖式,其主旨僅為示意及輔助說明書之用,未必為本發明實施後之真實比例與精準配置,故不應就所附之圖式的比例與配置關係解讀、侷限本發明於實際實施上的權利範圍,合先敘明。 In order to facilitate the reviewers to understand the technical features, content, advantages, and effects of the present invention, the present invention is described in detail in the form of embodiments with accompanying drawings as follows, and the diagrams used therein are: The subject matter is only for the purpose of illustration and auxiliary description, and may not be the true proportions and precise configuration after the implementation of the present invention. Therefore, it should not be interpreted in terms of the proportions and configuration relationships of the attached drawings, and should not limit the scope of rights of the present invention in actual implementation. , Hexian explained.

首先,為了讓 貴審查委員更瞭解本發明之技術特徵,將簡要說明波前之基本概念,當光學元件製造後組裝於光學系統時,由於環境溫度、重力或外力的緣故,都會使鏡片產生微小的變形,而這些微小的變 形對光學系統的成像品質會產生一定的影響,其中光學元件係可經由計算表面格點之X、Y與Z等三軸項之變形,以轉換成光軸方向的變形(sag);荷蘭物理學家弗里茨‧塞爾尼克(Frits Zernike)於西元1953年研究相位對比顯微鏡(phase contrast microscope),係以不破壞細胞的方式觀察活體細胞的內部結構,因而獲得諾貝爾獎,此外,其亦在光學領域發表了Zernike多項式演算法,以方便評估各項像差對光學系統之影響,而被廣泛應用在光學設計領域上,光學系統表面光軸方向之變形可以使用Zernike多項式演算法轉換成光學波前像差,使用Zernike多項式演算法擬合的像差項次可以代表鏡面變形所產生的像差,將像差帶入光學軟體中,可有效計算鏡片之調制轉換函數(Modulation Transfer Function,MTF)與評估整體效能;接著,請參閱第1圖與第2圖所示,為本發明同軸多波長光學元件檢測系統其一較佳實施例之整體架構立體圖,以及整體架構側視圖,其中本發明之同軸多波長光學元件檢測系統(1)係至少包括有:一基座(11),係用以承載鏡片檢測系統(1);在本發明其一較佳實施例中,以金屬材質所製備而成的基座(11)係用以支撐本發明之同軸多波長光學元件檢測系統(1)的整體架構;一載台(12),係設置於基座(11)上且其中間部位係開設有一開口(圖式未標示),其中載台(12)係用以承載至少一待測樣品(2);此外,載台(12)係可進一步設置有一進料裝置(121),進料裝置(121)係用以承載待測樣品(2);再者,進料裝置(121)係為Tray盤、移動式載盤、固定式載盤、輸送帶或卡匣等其中之一種裝置;此外,載台(12)係可進一步設置有一移動平台(122);再者,移動平台(122)係設置有一X軸調整模組(1221)與一Y軸調整 模組(1222),X軸調整模組(1221)與Y軸調整模組(1222)係承載進料裝置(121)以分別進行X軸向與Y軸向之移動;此外,載台(12)係可進一步設置有一Z軸調整模組(123),Z軸調整模組(123)係調整載台(12)於基座(11)上進行Z軸向之移動;在本發明其一較佳實施例中,複數個待測樣品(2)係置放於以Tray盤態樣呈現的進料裝置(121)上,而進料裝置(121)係設置於移動平台(122)上,而移動平台(122)係設置於載台(12)上,且載台(12)係設置於基座(11)上且其中間部位係開設有開口,其中移動平台(122)係設置有X軸調整模組(1221)與Y軸調整模組(1222),以分別承載進料裝置(121)進行X軸向與Y軸向之移動,載台(12)亦設置有Z軸調整模組(123),以調整載台(12)於基座(11)上進行Z軸向之移動,也就是說,承載待測樣品(2)之移動平台(122)係可進行X、Y和Z等三個軸向之移動,以使待測樣品(2)依檢測之需求而移動至適當之位置;一光學投射單元(13),係設置於基座(11)下端部,光學投射單元(13)係包含不同波長之複數發光源(131)係經由共軸透鏡(133)共軸化光路後朝向載台(12)之開口處發射一光束(圖式未標示)以通過待測樣品(2);此外,複數發光源(131)可為一雷射裝置或LED裝置,較佳係為氦氖雷射裝置;在本發明其一較佳實施例中,以氦氖雷射裝置態樣呈現的複數發光源(131)係設置於基座(11)之下端部,經由共軸透鏡(133)共軸化光路後朝向載台(12)之開口處發射一光束通過待測樣品(2);一光學聚焦單元(14),係包括有一設置於載台(12)下方之第一透鏡模組(141),以及一設置於載台(12)上方之第二透鏡模組(142),其中第一透鏡模組(141)係將光學投射單元(13)投射之光束聚焦於待測樣品(2) 上,而第二透鏡模組(142)係用以接收一穿透待測樣品(2)之穿透光束(圖式未標示)並聚焦向上傳遞;此外,光學投射單元(13)與第一透鏡模組(141)之間係進一步設置有一空間濾波單元(143);在本發明其一較佳實施例中,光學聚焦單元(14)係由第一透鏡模組(141)與第二透鏡模組(142)所組合而成,其中第一透鏡模組(141)係設置於載台(12)與光學投射單元(13)之間,以接收並聚焦光學投射單元(13)發射之光束於待測樣品(2)上,而第二透鏡模組(142)係設置於載台(12)上方,以接收光束穿透待測樣品(2)而形成之穿透光束並聚焦且向上傳遞至波前感測單元(15),而光學投射單元(13)與第一透鏡模組(141)之間係設置有空間濾波單元(143),其中空間濾波單元(143)係過濾不需要之波段的光源;一波前感測單元(15),係設置於第二透鏡模組(142)之上方,波前感測單元(15)係包括有一繞射光學元件模組(圖式未標示)、一連接該繞射光學元件模組的感光耦合元件模組(圖式未標示),以及一連接繞射光學元件模組、一連接該繞射光學元件模組的感光耦合元件模組之波形產生模組(圖式未標示),繞射光學元件模組係接收穿透光束並形成複數個光點傳遞至感光耦合元件模組後傳遞至波形產生模組,波形產生模組係接受光點以經由一轉換公式產生一波前圖形;此外,波前感測單元(15)係為一Hartmann-Shack波前檢測器;此外,轉換公式係為Zernike多項式演算法;在本發明其一較佳實施例中,設置於第二透鏡模組(142)上方之波前感測單元(15)係接收由待測樣品(2)穿透之穿透光束,並經由內建於波前感測單元(15)且以繞射光學元件模組形成複數個光點,再由感光耦合元件模組接收後傳遞至波形產生模組接受複數個光點且由轉換公式轉換成波前圖形(圖式未標 示),其中轉換公式係為Zernike多項式演算法,主要係將繞射光學元件模組所生成之複數個光點轉換成波前圖形;以及一比對單元(圖式未標示),係電性連接波前感測單元(15)以接收波前圖形,比對單元係進行波前圖形與一內建之對照波前圖形(圖式未標示)之比對動作,當比對結果小於一閥值時,待測樣品(2)係判定為一正常鏡片;在本發明其一較佳實施例中,比對單元最佳係為一電腦裝置,比對單元係接收波前感測單元(15)所產生之波前圖形,並與比對單元內建之對照波前圖形進行比對之動作,當比對結果小於一閥值時,待測樣品(2)係判定為一正常鏡片,其中對照波前圖形係為正常鏡片於本發明之同軸多波長光學元件檢測系統(1)檢測所獲得的波前圖形,故只要待測樣品(2)之波前圖形與正常鏡片的對照波前圖形之差異在一定的範圍內,則待測樣品(2)即被認定為正常。 First of all, in order to let your reviewer better understand the technical features of the present invention, the basic concept of wavefront will be briefly explained. When the optical element is manufactured and assembled in the optical system, due to the environmental temperature, gravity or external force, the lens will produce tiny amounts. Deformation, and these small changes The shape will have a certain impact on the imaging quality of the optical system. Among them, the optical element can be transformed into the deformation of the optical axis direction (sag) by calculating the deformation of the X, Y, and Z of the surface grid points; Dutch Physics The scientist Frits Zernike studied the phase contrast microscope (phase contrast microscope) in 1953, which observes the internal structure of living cells in a way that does not damage the cells, and thus won the Nobel Prize. In addition, his Zernike polynomial algorithm was also published in the optical field to facilitate the evaluation of the influence of various aberrations on the optical system. It is widely used in the field of optical design. The deformation of the optical axis direction on the surface of the optical system can be converted into optics using the Zernike polynomial algorithm. Wavefront aberrations. The aberration items fitted by the Zernike polynomial algorithm can represent the aberrations caused by the deformation of the mirror. The aberrations are brought into the optical software, which can effectively calculate the Modulation Transfer Function (MTF) of the lens. ) And evaluate the overall performance; then, please refer to Figures 1 and 2, which are a perspective view of the overall architecture and a side view of the overall architecture of a preferred embodiment of the coaxial multi-wavelength optical component inspection system of the present invention, in which the present invention The coaxial multi-wavelength optical element detection system (1) at least includes: a base (11) for carrying the lens detection system (1); in a preferred embodiment of the present invention, it is made of metal material The resulting base (11) is used to support the overall structure of the coaxial multi-wavelength optical element detection system (1) of the present invention; a carrier (12) is set on the base (11) and the middle part is An opening (not shown in the figure) is opened, in which the carrier (12) is used to carry at least one sample (2) to be tested; in addition, the carrier (12) can be further provided with a feeding device (121) for feeding The device (121) is used to carry the sample (2) to be tested; in addition, the feeding device (121) is one of a Tray tray, a movable tray, a fixed tray, a conveyor belt or a cassette; In addition, the carrier (12) can be further provided with a mobile platform (122); in addition, the mobile platform (122) is provided with an X-axis adjustment module (1221) and a Y-axis adjustment module. The module (1222), the X-axis adjustment module (1221) and the Y-axis adjustment module (1222) carry the feeding device (121) to move the X-axis and Y-axis respectively; in addition, the carrier (12 ) Can be further provided with a Z-axis adjustment module (123), the Z-axis adjustment module (123) adjusts the stage (12) to move in the Z-axis on the base (11); In a preferred embodiment, a plurality of samples to be tested (2) are placed on the feeding device (121) presented in the form of a Tray plate, and the feeding device (121) is set on the mobile platform (122), and The mobile platform (122) is arranged on the carrier (12), and the carrier (12) is arranged on the base (11) with an opening in the middle part, and the movable platform (122) is provided with an X axis The adjustment module (1221) and the Y-axis adjustment module (1222) respectively carry the feeding device (121) to move in the X-axis and Y-axis directions. The carrier (12) is also provided with a Z-axis adjustment module ( 123), to adjust the stage (12) on the base (11) to move in the Z axis, that is to say, the moving platform (122) carrying the sample (2) to be tested can perform X, Y, Z, etc. Movement in three axes, so that the sample (2) to be tested can be moved to an appropriate position according to the needs of the test; an optical projection unit (13) is arranged at the lower end of the base (11), the optical projection unit (13) ) Is a complex light source (131) containing different wavelengths that emits a light beam (not shown in the figure) toward the opening of the stage (12) through a coaxial lens (133) after coaxializing the optical path to pass through the sample (2) ); In addition, the plurality of light-emitting sources (131) can be a laser device or an LED device, preferably a helium-neon laser device; in a preferred embodiment of the present invention, it is presented in the form of a helium-neon laser device The plural luminous sources (131) are arranged at the lower end of the base (11), after coaxializing the optical path through the coaxial lens (133), they emit a light beam toward the opening of the stage (12) and pass through the sample (2) An optical focusing unit (14) includes a first lens module (141) arranged below the carrier (12), and a second lens module (142) arranged above the carrier (12), Among them, the first lens module (141) focuses the beam projected by the optical projection unit (13) on the sample to be tested (2) The second lens module (142) is used to receive a penetrating light beam (not shown in the figure) that penetrates the sample (2) and focus it upwards; in addition, the optical projection unit (13) and the first A spatial filter unit (143) is further provided between the lens modules (141); in a preferred embodiment of the present invention, the optical focusing unit (14) is composed of a first lens module (141) and a second lens The module (142) is assembled, wherein the first lens module (141) is arranged between the carrier (12) and the optical projection unit (13) to receive and focus the light beam emitted by the optical projection unit (13) On the sample (2) to be tested, and the second lens module (142) is arranged above the stage (12) to receive the penetrating beam formed by the beam penetrating the sample (2) and focus and transmit it upward To the wavefront sensing unit (15), and between the optical projection unit (13) and the first lens module (141), a spatial filter unit (143) is arranged, wherein the spatial filter unit (143) filters the unnecessary Wave band light source; a wavefront sensing unit (15) is arranged above the second lens module (142), and the wavefront sensing unit (15) includes a diffractive optical element module (not shown in the figure) ), a photosensitive coupling element module (not shown in the figure) connected to the diffractive optical element module, and a photosensitive coupling element module connected to the diffractive optical element module and a photosensitive coupling element module connected to the diffractive optical element module Waveform generating module (not shown in the figure), the diffractive optical element module receives the penetrating light beam and forms a plurality of light spots which are transmitted to the photosensitive coupling element module and then transmitted to the waveform generating module, and the waveform generating module receives the light The point is to generate a wavefront pattern through a conversion formula; in addition, the wavefront sensing unit (15) is a Hartmann-Shack wavefront detector; in addition, the conversion formula is a Zernike polynomial algorithm; In a preferred embodiment, the wavefront sensing unit (15) disposed above the second lens module (142) receives the penetrating light beam penetrated by the sample (2) to be tested, and the wavefront sensing unit (15) is built-in The unit (15) uses a diffractive optical element module to form a plurality of light spots, which are received by the photosensitive coupling element module and then transferred to the waveform generating module to receive the multiple light spots and converted into a wavefront pattern by a conversion formula (graphic Unmarked (Shown), where the conversion formula is a Zernike polynomial algorithm, which mainly converts a plurality of light points generated by the diffractive optical element module into a wavefront pattern; and a comparison unit (the drawing is not marked), which is electrical The wavefront sensing unit (15) is connected to receive the wavefront pattern, and the comparison unit performs a comparison action between the wavefront pattern and a built-in control wavefront pattern (the figure is not marked). When the comparison result is less than a valve When the value, the test sample (2) is judged to be a normal lens; in a preferred embodiment of the present invention, the comparison unit is preferably a computer device, and the comparison unit is a receiving wavefront sensing unit (15 ) The wavefront pattern generated by the comparison unit is compared with the control wavefront pattern built in the comparison unit. When the comparison result is less than a threshold, the test sample (2) is judged to be a normal lens. The control wavefront pattern is the wavefront pattern obtained by the detection of the normal lens in the coaxial multi-wavelength optical element detection system (1) of the present invention, so only the wavefront pattern of the test sample (2) and the control wavefront pattern of the normal lens If the difference is within a certain range, the sample (2) to be tested is regarded as normal.

此外,同軸多波長光學元件檢測系統(1)係可進一步裝設於一不透光機殼(3)之內部;再者,比對單元係可進一步電性連接一顯示單元(16),顯示單元(16)係架設於機殼(3)之上端部,以顯示比對單元比對之結果;請一併參閱第3圖所示,為本發明鏡片檢測系統其一較佳實施例之機殼與顯示單元架設示意圖,其中機殼(3)係為一四方形不透光之箱體,箱體內部係開設有一容置空間(圖式未標示),而本發明之同軸多波長光學元件檢測系統(1)係設置於箱體之容置空間內,可防止待測樣品(2)檢測時之不必要的外界干擾,而機殼(3)之上端部係架設有與比對單元電性連接之顯示單元(16),顯示器係可顯示波前圖形與比對單元比對之結果,以供量測者參考。 In addition, the coaxial multi-wavelength optical element detection system (1) can be further installed inside an opaque casing (3); furthermore, the comparison unit can be further electrically connected to a display unit (16) to display The unit (16) is erected on the upper end of the casing (3) to display the result of the comparison unit; please also refer to Figure 3, which is a preferred embodiment of the lens inspection system of the present invention. A schematic diagram of the erection of the housing and the display unit, where the housing (3) is a square opaque box, and there is an accommodating space inside the box (not shown in the figure), and the coaxial multi-wavelength optical element of the present invention The detection system (1) is installed in the accommodating space of the box to prevent unnecessary external interference during the detection of the sample to be tested (2), and the upper end of the casing (3) is equipped with a comparison unit electric The display unit (16), which is sexually connected, can display the comparison result of the wavefront graph and the comparison unit for the reference of the measurer.

接著,為使 貴審查委員能進一步瞭解本發明之目的、特徵, 以及所欲達成之功效,以下茲舉本發明同軸多波長光學元件檢測系統(1)的具體實際實施例,進一步證明本發明之鏡片檢測系統(1)可實際應用之範圍,但不意欲以任何形式限制本發明之範圍;當一使用者欲進行至少一待測樣品(2)之檢測時,可使用本發明之同軸多波長光學元件檢測系統(1)進行待測樣品(2)之檢測程序,有效檢測光束穿透待測樣品(2)後進入一波前感測單元(15)所形成之波前圖形,並與正常鏡片之對照波前圖形比對之間的差異,以有效檢測待測樣品(2)的優劣,確實達到節省鏡片檢測時間與檢測成本,以及達成非破壞性鏡片檢測之目的等主要優勢;首先,準備一基座(11),其中基座(11)係用以承載同軸多波長光學元件檢測系統(1);接著,準備一載台(12),其中載台(12)係設置於基座(11)上且其中間部位係開設有一開口,其中載台(12)係用以承載至少一待測樣品(2);接續,準備一光學投射單元(13),其中光學投射單元(13)係設置於基座(11)下端部,光學投射單元(13)係包含不同波長之複數發光源(131)經由共軸透鏡(133)共軸化光路後朝向載台(12)之開口處發射一光束以通過待測樣品(2);接著,準備一光學聚焦單元(14),其中光學聚焦單元(14)係包括有一設置於載台(12)下方之第一透鏡模組(141),以及一設置於載台(12)上方之第二透鏡模組(142),其中第一透鏡模組(141)係為一多角菱形透鏡將光學投射單元(13)之光束聚焦於待測樣品(2)上,,而第二透鏡模組(142)係用以接收一穿透待測鏡片(2)之穿透光束並聚焦向上傳遞;之後,準備一波前感測單元(15),其中波前感測單元(15)係設置於第二透鏡模組(142)之上方,波前感測單元(15)係包括有一一繞射光學元件模組(圖式未標示)、一連接該繞射光學元件模組的感光耦合元件模組(圖式未標示),以及一連接繞射光學元件模組、一連接該繞射光學元件模組 的感光耦合元件模組之波形產生模組(圖式未標示),繞射光學元件模組係接收穿透光束並形成複數個光點傳遞至感光耦合元件模組後傳遞至波形產生模組,波形產生模組係接受光點以經由一轉換公式產生一波前圖形;最後,準備一比對單元,其中比對單元係電性連接波前感測單元(15)以接收波前圖形,比對單元係進行波前圖形與一內建之對照波前圖形之比對動作,當比對結果小於一閥值時,待測樣品(2)係判定為一正常鏡片,其中對照波前圖形係為正常鏡片於本發明之鏡片檢測系統(1)檢測所獲得的波前圖形,故只要待測鏡片(2)之波前圖形與正常鏡片的對照波前圖形之差異在一定的範圍內,則待測鏡片(2)即被認定為正常鏡片;在本發明之鏡片檢測系統(1)硬體設備完成後,使用者僅需將待測樣品(2)之進料裝置(121)放置於載台(12)上的移動平台(122),再藉由X軸調整模組(1221)、Y軸調整模組(1222)與Z軸調整模組(123)調整待測鏡片(2)的方位,以讓光學投射單元(13)發射之光束經由光學聚焦單元(14)之第一透鏡模組(141)與開口通過待測樣品(2),再由第二透鏡模組(142)接收穿透光束並聚焦向上傳遞至Hartmann-Shack波前檢測器的波前感測單元(15),再由波前感測單元(15)將光束轉換成波前圖形後由比對單元與內建之對照波前圖形比對,當比對結果小於一閥值時,待測樣品(2)係判定為正常,本發明之同軸多波長光學元件檢測系統(1)可確實達到節省檢測時間與檢測成本,以及達成非破壞性檢測之目的等主要優勢。 Next, in order to enable your reviewer to further understand the purpose and features of the present invention, As well as the desired effect, the following specific examples of the coaxial multi-wavelength optical element inspection system (1) of the present invention are given below to further prove the scope of practical application of the lens inspection system (1) of the present invention, but it is not intended to be any The form limits the scope of the present invention; when a user wants to detect at least one sample (2) to be tested, the coaxial multi-wavelength optical element detection system (1) of the present invention can be used to perform the test procedure of the sample (2) to be tested , The effective detection beam penetrates the sample (2) and enters the wavefront pattern formed by a wavefront sensing unit (15), and compares the difference with the contrast wavefront pattern of the normal lens to effectively detect the difference The pros and cons of the test sample (2) have indeed achieved the main advantages of saving lens inspection time and cost, and achieving the purpose of non-destructive lens inspection; first, prepare a base (11), where the base (11) is used for Carrying the coaxial multi-wavelength optical element detection system (1); then, prepare a carrier (12), wherein the carrier (12) is set on the base (11) with an opening in the middle part, and the carrier (12) 12) is used to carry at least one sample (2) to be tested; continue, prepare an optical projection unit (13), wherein the optical projection unit (13) is arranged at the lower end of the base (11), and the optical projection unit (13) A complex light source (131) of different wavelengths passes through a coaxial lens (133) to coaxialize the light path and emits a light beam toward the opening of the stage (12) to pass through the sample (2) to be tested; then, prepare an optical focus Unit (14), wherein the optical focusing unit (14) includes a first lens module (141) arranged below the carrier (12), and a second lens module (141) arranged above the carrier (12) 142), where the first lens module (141) is a polygonal rhombus lens to focus the beam of the optical projection unit (13) on the sample (2), and the second lens module (142) is used To receive a penetrating light beam that penetrates the lens (2) to be tested and focus it upwards; then, prepare a wavefront sensing unit (15), wherein the wavefront sensing unit (15) is arranged in the second lens module Above (142), the wavefront sensing unit (15) includes a diffractive optical element module (not shown in the figure) and a photosensitive coupling element module connected to the diffractive optical element module (figure (Not marked), and a module connected with a diffractive optical element, and a module connected with the diffractive optical element Waveform generation module (not shown in the figure) of the photosensitive coupling element module. The diffractive optical element module receives the penetrating light beam and forms a plurality of light spots which are transmitted to the photosensitive coupling element module and then transmitted to the waveform generation module. The waveform generation module receives the light points to generate a wavefront pattern through a conversion formula; finally, a comparison unit is prepared, wherein the comparison unit is electrically connected to the wavefront sensing unit (15) to receive the wavefront pattern, and compare Perform a comparison action between the wavefront pattern and a built-in control wavefront pattern on the unit. When the comparison result is less than a threshold, the test sample (2) is judged to be a normal lens, and the control wavefront pattern is The wavefront pattern of the normal lens is detected by the lens detection system (1) of the present invention, so as long as the difference between the wavefront pattern of the lens to be tested (2) and the contrast wavefront pattern of the normal lens is within a certain range, then The lens to be tested (2) is recognized as a normal lens; after the hardware equipment of the lens detection system (1) of the present invention is completed, the user only needs to place the feeding device (121) of the sample to be tested (2) on the carrier The moving platform (122) on the table (12), and then adjust the orientation of the lens (2) to be tested through the X-axis adjustment module (1221), Y-axis adjustment module (1222) and Z-axis adjustment module (123) , So that the light beam emitted by the optical projection unit (13) passes through the sample (2) through the first lens module (141) and the opening of the optical focusing unit (14), and then is received and passed through by the second lens module (142) The transmitted light beam is focused and transmitted upward to the wavefront sensing unit (15) of the Hartmann-Shack wavefront detector, and then the light beam is converted into a wavefront pattern by the wavefront sensing unit (15), and the comparison unit is compared with the built-in wavefront pattern. Wavefront pattern comparison, when the comparison result is less than a threshold, the sample (2) to be tested is judged to be normal. The coaxial multi-wavelength optical element detection system (1) of the present invention can indeed save detection time and cost. And the main advantages of achieving the purpose of non-destructive testing.

由上述之實施說明可知,本發明之同軸多波長光學元件檢測系統與現有技術相較之下,本發明係具有以下優點: As can be seen from the above implementation description, compared with the prior art, the coaxial multi-wavelength optical element detection system of the present invention has the following advantages:

1.本發明之同軸多波長光學元件檢測系統主要係藉由複數共軸不同波長之發光源結合Hartmann-Shack波前檢測器之硬體設計,有效檢 測雷射光束穿透待測樣品後進入波前檢測器所形成之波前圖形,並與正常樣品之對照波前圖形比對之間的差異,以有效檢測待測待測物的優劣,確實達到節省檢測時間與檢測成本,以及達成非破壞性檢測目的等主要優勢。 1. The coaxial multi-wavelength optical component detection system of the present invention is mainly based on the combination of multiple coaxial light sources with different wavelengths and the hardware design of the Hartmann-Shack wavefront detector, which can effectively detect The measurement laser beam penetrates the sample to be tested and enters the wavefront pattern formed by the wavefront detector, and compares the difference with the contrast wavefront pattern of the normal sample to effectively detect the quality of the tested object. To achieve the main advantages of saving inspection time and inspection cost, and achieving the purpose of non-destructive inspection.

2.本發明之同軸多波長光學元件檢測系統主要係結合複數共軸不同波長之發光源與波前檢測器之硬體設計,可有效實現一顆待測鏡片或待測鏡頭之檢測時間小於1.5秒之需求,確實達到待測鏡片或待測鏡頭全檢之目的,以有效節省檢測時間與縮短製程時間之主要優勢。 2. The coaxial multi-wavelength optical element detection system of the present invention is mainly combined with the hardware design of multiple coaxial light sources of different wavelengths and wavefront detectors, which can effectively realize that the detection time of a lens to be tested or a lens to be tested is less than 1.5 The demand of seconds really achieves the purpose of full inspection of the lens to be tested or the lens to be tested, which is the main advantage of effectively saving the inspection time and shortening the process time.

綜上所述,本發明之鏡片檢測系統,的確能藉由上述所揭露之實施例,達到所預期之使用功效,且本發明亦未曾公開於申請前,誠已完全符合專利法之規定與要求。爰依法提出發明專利之申請,懇請惠予審查,並賜准專利,則實感德便。 In summary, the lens inspection system of the present invention can indeed achieve the expected use effect through the embodiments disclosed above, and the present invention has not been disclosed before the application, and it has fully complied with the provisions and requirements of the patent law. . If you file an application for a patent for invention in accordance with the law, you are kindly requested to review and grant a quasi-patent.

惟,上述所揭示之圖示及說明,僅為本發明之較佳實施例,非為限定本發明之保護範圍;大凡熟悉該項技藝之人士,其所依本發明之特徵範疇,所作之其它等效變化或修飾,皆應視為不脫離本發明之設計範疇。 However, the figures and descriptions disclosed above are only preferred embodiments of the present invention, and are not intended to limit the scope of protection of the present invention. Anyone familiar with the art will do other things based on the characteristic scope of the present invention. Equivalent changes or modifications should be regarded as not departing from the design scope of the present invention.

(1)‧‧‧同軸多波長光學元件檢測系統 (1)‧‧‧Coaxial multi-wavelength optical component detection system

(2)‧‧‧待測樣品 (2)‧‧‧Sample to be tested

(11)‧‧‧基座 (11)‧‧‧Base

(12)‧‧‧載台 (12)‧‧‧Carrier

(121)‧‧‧進料裝置 (121)‧‧‧Feeding device

(122)‧‧‧移動平台 (122)‧‧‧Mobile Platform

(1221)‧‧‧X軸調整模組 (1221)‧‧‧X-axis adjustment module

(1222)‧‧‧Y軸調整模組 (1222)‧‧‧Y-axis adjustment module

(123)‧‧‧Z軸調整模組 (123)‧‧‧Z axis adjustment module

(13)‧‧‧光學投射單元 (13)‧‧‧Optical projection unit

(131)‧‧‧複數發光單元 (131)‧‧‧Multiple light-emitting units

(132)‧‧‧快門模組 (132)‧‧‧Shutter Module

(133)‧‧‧共軸透鏡 (133)‧‧‧Coaxial lens

(14)‧‧‧光學聚焦單元 (14)‧‧‧Optical Focus Unit

(141)‧‧‧第一透鏡模組 (141)‧‧‧The first lens module

(142)‧‧‧第二透鏡模組 (142)‧‧‧Second lens module

(143)‧‧‧空間濾波單元 (143)‧‧‧Spatial Filter Unit

(15)‧‧‧波前感測單元 (15)‧‧‧Wavefront sensing unit

Claims (11)

一種同軸多波長光學元件檢測系統,係至少包括有:一基座,係用以承載該同軸多波長光學元件檢測系統;一載台,係設置於該基座上且其中間部位係開設有一開口,其中該載台係用以承載至少一待測樣品;一光學投射單元,係設置於該基座下端部,該光學投射單元係包含複數發光源,係發射複數不同波長之光束,一共軸透鏡,該複數發光源所發射之該複數不同波長之光束係經由共軸透鏡共軸化光路後,朝向該載台之開口處發射一光束以通過該待測樣品;一光學聚焦單元,係包括有一設置於該載台下方之第一透鏡模組,以及一設置於該載台上方之第二透鏡模組,其中該第一透鏡模組係將該光學投射單元之光束聚焦於該待測鏡片上,而該第二透鏡模組係用以接收一穿透該待測鏡片之穿透光束並聚焦向上傳遞;一波前感測單元,係設置於該第二透鏡模組之上方,該波前感測單元係包括有一繞射光學元件模組,一連接該繞射光學元件模組的感光耦合元件模組以及一波前波形產生模組,該繞射光學元件模組係接收該穿透光束並形成複數個光點傳遞至該波形產生模組,該波形產生模組係接受該等光點以經由一轉換公式產生一波前圖形;以及一比對單元,係電性連接該波前感測單元以接收該波前圖形,該比對單元係進行該波前圖形與一內建之對照波前圖形之比對動作。 A coaxial multi-wavelength optical element detection system at least includes: a base for carrying the coaxial multi-wavelength optical element detection system; a carrier set on the base with an opening in the middle part , Wherein the stage is used to carry at least one sample to be tested; an optical projection unit is arranged at the lower end of the base, the optical projection unit includes a plurality of light sources, emits a plurality of beams of different wavelengths, and a coaxial lens , The multiple light beams of different wavelengths emitted by the multiple light-emitting sources pass through the coaxial lens to coaxialize the optical path, and then emit a light beam toward the opening of the stage to pass through the sample to be tested; an optical focusing unit includes a A first lens module set below the carrier, and a second lens module set above the carrier, wherein the first lens module focuses the light beam of the optical projection unit on the lens to be tested , And the second lens module is used to receive a penetrating light beam penetrating the lens to be tested and focused and transmitted upward; a wavefront sensing unit is arranged above the second lens module, the wavefront The sensing unit includes a diffractive optical element module, a photosensitive coupling element module connected to the diffractive optical element module, and a wavefront waveform generating module, the diffractive optical element module receives the penetrating light beam A plurality of light points are formed and transmitted to the waveform generation module, the waveform generation module receives the light points to generate a wavefront pattern through a conversion formula; and a comparison unit is electrically connected to the wavefront sensor The measuring unit receives the wavefront pattern, and the comparison unit performs a comparison action between the wavefront pattern and a built-in contrast wavefront pattern. 如請求項1所述之同軸多波長光學元件檢測系統,其中該共軸透鏡係為一多角菱鏡。 The coaxial multi-wavelength optical element detection system according to claim 1, wherein the coaxial lens is a polygonal diamond mirror. 如請求項2所述之同軸多波長光學元件檢測系統,其中該第一透鏡模組與待測樣品間包含有一空間濾波單元,該空間濾波單元係用以過濾理想光點以外的空間雜訊並放大該光學投射單元發射之光束。 The coaxial multi-wavelength optical element detection system according to claim 2, wherein a spatial filter unit is included between the first lens module and the sample to be tested, and the spatial filter unit is used to filter spatial noise other than the ideal light spot and Amplify the light beam emitted by the optical projection unit. 如請求項3所述之同軸多波長光學元件檢測系統,其中該多角菱鏡與該複數發光源之間係進一步設有複數個快門裝置。 The coaxial multi-wavelength optical element detection system according to claim 3, wherein a plurality of shutter devices are further provided between the polygonal diamond mirror and the plurality of light-emitting sources. 如請求項3所述之同軸多波長光學元件檢測系統,其中該複數個快門裝置數量係同等對應該發光源的數量。 The coaxial multi-wavelength optical element detection system according to claim 3, wherein the number of the plurality of shutter devices is equivalent to the number of light-emitting sources. 如申請專利範圍第4、5項所述之同軸多波長光學元件檢測系統,其中該載台係進一步設置有一移動平台用以承載一進料裝置,該移動平台係設置有一X軸調整模組與一Y軸調整模組,該X軸調整模組與該Y軸調整模組係承載該進料裝置以分別進行X軸向與Y軸向之移動。 For the coaxial multi-wavelength optical component inspection system described in items 4 and 5 of the scope of patent application, the carrier is further provided with a mobile platform for carrying a feeding device, and the mobile platform is provided with an X-axis adjustment module and A Y-axis adjustment module. The X-axis adjustment module and the Y-axis adjustment module carry the feeding device to move in the X-axis and Y-axis respectively. 如申請專利範圍第6項所述之同軸多波長光學元件檢測系統,其中該載台係進一步設置有一Z軸調整模組,該Z軸調整模組係調整該載台於該基座上進行Z軸向之移動。 For example, in the coaxial multi-wavelength optical component inspection system described in item 6 of the scope of patent application, the carrier is further provided with a Z-axis adjustment module, and the Z-axis adjustment module adjusts the carrier on the base to perform Z Axial movement. 如申請專利範圍第7項所述之同軸多波長光學元件檢測系統,其中該波前感測單元係為一Hartmann-Shack波前檢測器。 In the coaxial multi-wavelength optical element detection system described in item 7 of the scope of patent application, the wavefront sensing unit is a Hartmann-Shack wavefront detector. 如申請專利範圍第8項所述之同軸多波長光學元件檢測系統,其中該轉換公式係為Zernike多項式演算法。 For the coaxial multi-wavelength optical element detection system described in item 8 of the scope of patent application, the conversion formula is a Zernike polynomial algorithm. 如申請專利範圍第9項所述之同軸多波長光學元件檢測系統,其中該鏡片檢測系統係進一步裝設於一機殼之內部,該機殼內部係不透光之材質。 For the coaxial multi-wavelength optical element detection system described in item 9 of the scope of patent application, the lens detection system is further installed inside a casing, and the inside of the casing is made of an opaque material. 如申請專利範圍第10項所述之同軸多波長光學元件檢測系統,其中該 待測樣品係包含複數個光學鏡片。 The coaxial multi-wavelength optical element inspection system as described in item 10 of the scope of patent application, wherein the The sample to be tested contains a plurality of optical lenses.
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