TW202102547A - Photocurable composition, method for producing uneven structure, method for forming fine uneven pattern and uneven structure - Google Patents

Photocurable composition, method for producing uneven structure, method for forming fine uneven pattern and uneven structure Download PDF

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TW202102547A
TW202102547A TW109111213A TW109111213A TW202102547A TW 202102547 A TW202102547 A TW 202102547A TW 109111213 A TW109111213 A TW 109111213A TW 109111213 A TW109111213 A TW 109111213A TW 202102547 A TW202102547 A TW 202102547A
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photocurable composition
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mold
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小田隆志
大喜田尚紀
和知浩子
山本慎吾
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日商三井化學股份有限公司
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    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08LCOMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L63/00Compositions of epoxy resins; Compositions of derivatives of epoxy resins
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/075Silicon-containing compounds
    • G03F7/0755Non-macromolecular compounds containing Si-O, Si-C or Si-N bonds
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29CSHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C59/00Surface shaping of articles, e.g. embossing; Apparatus therefor
    • B29C59/02Surface shaping of articles, e.g. embossing; Apparatus therefor by mechanical means, e.g. pressing
    • B29C59/022Surface shaping of articles, e.g. embossing; Apparatus therefor by mechanical means, e.g. pressing characterised by the disposition or the configuration, e.g. dimensions, of the embossments or the shaping tools therefor
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    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G59/00Polycondensates containing more than one epoxy group per molecule; Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups
    • C08G59/18Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing
    • C08G59/20Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing characterised by the epoxy compounds used
    • C08G59/22Di-epoxy compounds
    • C08G59/24Di-epoxy compounds carbocyclic
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G59/00Polycondensates containing more than one epoxy group per molecule; Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups
    • C08G59/18Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing
    • C08G59/68Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing characterised by the catalysts used
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G65/00Macromolecular compounds obtained by reactions forming an ether link in the main chain of the macromolecule
    • C08G65/02Macromolecular compounds obtained by reactions forming an ether link in the main chain of the macromolecule from cyclic ethers by opening of the heterocyclic ring
    • C08G65/04Macromolecular compounds obtained by reactions forming an ether link in the main chain of the macromolecule from cyclic ethers by opening of the heterocyclic ring from cyclic ethers only
    • C08G65/06Cyclic ethers having no atoms other than carbon and hydrogen outside the ring
    • C08G65/16Cyclic ethers having four or more ring atoms
    • C08G65/18Oxetanes
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/0002Lithographic processes using patterning methods other than those involving the exposure to radiation, e.g. by stamping
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/038Macromolecular compounds which are rendered insoluble or differentially wettable
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/075Silicon-containing compounds
    • G03F7/0757Macromolecular compounds containing Si-O, Si-C or Si-N bonds
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F9/00Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
    • G03F9/70Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
    • G03F9/7003Alignment type or strategy, e.g. leveling, global alignment
    • G03F9/7042Alignment for lithographic apparatus using patterning methods other than those involving the exposure to radiation, e.g. by stamping or imprinting
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/027Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/027Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
    • H01L21/0271Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29KINDEXING SCHEME ASSOCIATED WITH SUBCLASSES B29B, B29C OR B29D, RELATING TO MOULDING MATERIALS OR TO MATERIALS FOR MOULDS, REINFORCEMENTS, FILLERS OR PREFORMED PARTS, e.g. INSERTS
    • B29K2063/00Use of EP, i.e. epoxy resins or derivatives thereof, as moulding material
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29KINDEXING SCHEME ASSOCIATED WITH SUBCLASSES B29B, B29C OR B29D, RELATING TO MOULDING MATERIALS OR TO MATERIALS FOR MOULDS, REINFORCEMENTS, FILLERS OR PREFORMED PARTS, e.g. INSERTS
    • B29K2071/00Use of polyethers, e.g. PEEK, i.e. polyether-etherketone or PEK, i.e. polyetherketone or derivatives thereof, as moulding material
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29KINDEXING SCHEME ASSOCIATED WITH SUBCLASSES B29B, B29C OR B29D, RELATING TO MOULDING MATERIALS OR TO MATERIALS FOR MOULDS, REINFORCEMENTS, FILLERS OR PREFORMED PARTS, e.g. INSERTS
    • B29K2105/00Condition, form or state of moulded material or of the material to be shaped
    • B29K2105/0002Condition, form or state of moulded material or of the material to be shaped monomers or prepolymers

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Abstract

A photocurable composition for forming a resin layer of an uneven structure, the uneven structure including: a substrate; and a resin layer which is provided on the substrate and has fine unevenness formed on the surface. A cured film of the photocurable composition has a surface free energy of 15 mJ/m2 to 40 mJ/m2 measured based on the Kitazaki-Hata theory, and a hardness of 0.05 GPa to 0.5 GPa measured using a nanoindenter.

Description

光硬化性組成物、凹凸結構體的製造方法、形成微細凹凸圖案的方法及凹凸結構體Photocurable composition, method for manufacturing uneven structure, method for forming fine uneven pattern, and uneven structure

本發明是有關於一種光硬化性組成物、凹凸結構體的製造方法、形成微細凹凸圖案的方法及凹凸結構體。The present invention relates to a photocurable composition, a method for manufacturing a concave-convex structure, a method for forming a fine concave-convex pattern, and a concave-convex structure.

作為於基板的表面形成微細凹凸圖案的方法,已知有光微影(photolithography)法或奈米壓印(nanoimprint)法。 光微影法的裝置價格高昂且製程複雜。相對於此,奈米壓印法具有可藉由簡便的裝置與製程而於基板的表面製作微細凹凸圖案的優點。另外,奈米壓印法對於形成寬度相對較寬且深的凹凸結構、或圓頂狀、四角錐、三角錐等多樣的形狀而言可視為較佳的方法。As a method of forming a fine uneven pattern on the surface of a substrate, a photolithography method or a nanoimprint method is known. The device of the photolithography method is expensive and the manufacturing process is complicated. In contrast to this, the nanoimprint method has the advantage of being able to produce fine concavo-convex patterns on the surface of the substrate with a simple device and process. In addition, the nanoimprint method can be regarded as a preferable method for forming a relatively wide and deep concave-convex structure, or various shapes such as a dome, a quadrangular pyramid, and a triangular pyramid.

通常,於工業性奈米壓印法中,首先,製作利用光微影法或電子束描繪法形成了表面的微細凹凸結構的價格高昂的母模(mother mold)。繼而,製造利用有機材料複製了母模的凹凸結構的廉價的複製模(replica mold)。複製模以考慮到生產性的一定的重覆使用次數加工被加工基板後,完成任務。於工業上,對複製模要求可耐重覆使用的功能。藉由增加重覆使用次數而有助於減低成本。Generally, in the industrial nanoimprint method, first, an expensive mother mold is produced in which the fine uneven structure on the surface is formed by the photolithography method or the electron beam drawing method. Then, an inexpensive replica mold in which the concave-convex structure of the master mold is replicated with an organic material is manufactured. After copying the mold to process the processed substrate for a certain number of repetitive use in consideration of productivity, the task is completed. In the industry, the duplication mold requires a function that can withstand repeated use. It helps reduce costs by increasing the number of repeated uses.

作為奈米壓印法的具體製程,廣泛利用如下紫外線(Ultraviolet,UV)方式:使光硬化性組成物與模具的凹凸面接液,並藉由光(UV)照射而加以硬化,然後進行剝離的步驟的UV方式。UV方式與加熱熔融壓接方式不同,具有無需大規模的加熱、壓接設備或容易組合輥對輥(roll to roll)等連續法等優點。As a specific process of the nanoimprint method, the following ultraviolet (Ultraviolet, UV) method is widely used: the photocurable composition is contacted with the uneven surface of the mold, and cured by light (UV) irradiation, and then peeled off. Step UV method. The UV method is different from the heating, melting and crimping method, and has the advantages of not requiring large-scale heating, crimping equipment, or easy combination of roll to roll (roll to roll) and other continuous methods.

針對作為複製模的適應,揭示了一種具有相對較良好的重覆性的材料(例如專利文獻1)。 根據該文獻,對包含丙烯酸酯與矽酮系巨分子單體及起始劑的組成物進行加熱聚合,使所獲得的樹脂組成物與母模的凹凸面接觸,並藉由加熱熔融壓接法來製作複製模。而且,於與光硬化性化合物的UV式奈米壓印中,實現20次左右的相對較良好的重覆性。 然而,專利文獻1中所記載的材料於製作複製模時需要加熱熔融壓接。即,即使是圖案區域為數厘米見方的凹凸結構的形成,為了於模具的凹凸結構中填充樹脂,亦需要利用具備加熱機構的裝置來施加高至20 MPa的壓力。因此,就複製模的製造法的觀點而言,對於工業製程的適應非常有限。In response to adaptation as a replication model, a material with relatively good repeatability is disclosed (for example, Patent Document 1). According to this document, a composition containing acrylate, silicone macromonomers and initiators is heated and polymerized, the resulting resin composition is brought into contact with the concave and convex surface of the master mold, and the heat is melted and pressure-bonded. To make a copy model. Moreover, in the UV-type nanoimprint with a photocurable compound, a relatively good repeatability of about 20 times was achieved. However, the material described in Patent Document 1 needs to be heated, melted, and pressure-bonded when making a replica mold. That is, even in the formation of a concave-convex structure with a pattern area of several centimeters square, in order to fill the concave-convex structure of the mold with resin, it is necessary to apply a pressure of up to 20 MPa using a device equipped with a heating mechanism. Therefore, from the viewpoint of the manufacturing method of the replica mold, the adaptation to the industrial process is very limited.

另外,作為可適應於UV方式的奈米壓印的材料,於專利文獻2中,作為塗佈性、速硬化性、薄膜硬化性優異且於奈米壓印法中形狀轉印性優異的材料,揭示了一種特定的陽離子硬化系材料。於專利文獻2中揭示了:關於重覆轉印性,可使用50次。 然而,專利文獻2是有關於一種圖案形狀為1微米~2微米尺寸的壓印。沒有與奈米尺寸級別的圖案形成相關的記載。 進而,於任意的揭示例中,關於複製模的適應,均未記載使用製作複製模的相同材料來重覆使用最初製作的複製模的適應。 [現有技術文獻] [專利文獻]In addition, as a material that can be adapted to the nanoimprint of the UV method, Patent Document 2 is a material that has excellent coating properties, rapid curing properties, and film curability, and excellent shape transferability in the nanoimprint method. , Reveals a specific cationic hardening material. Patent Document 2 discloses that it can be used 50 times with regard to the repeatability of transfer. However, Patent Document 2 relates to an imprint with a pattern shape of 1 to 2 microns in size. There is no record related to pattern formation at the nano-size level. Furthermore, in any of the disclosure examples, regarding the adaptation of the copy mold, there is no description of the adaptation of using the same material for making the copy mold to repeatedly use the copy mold that was originally made. [Prior Art Literature] [Patent Literature]

[專利文獻1]國際公開第2012/018043號 [專利文獻2]日本專利特開2018-141028號公報[Patent Document 1] International Publication No. 2012/018043 [Patent Document 2] Japanese Patent Laid-Open No. 2018-141028

[發明所欲解決之課題][The problem to be solved by the invention]

關於本發明者等人的發現,於對於奈米壓印法的工業製造方法的適應中,就包括複製模的製造步驟的製程整體及被加工基板的形狀(尺寸)自由度的觀點而言,現有技術並不滿足全部。特別是,以複製模為代表的奈米壓印用樹脂製模具形成中所使用的光硬化性組成物仍有改善的餘地。Regarding the findings of the inventors, in adapting to the industrial manufacturing method of the nanoimprint method, from the viewpoint of the overall process including the manufacturing steps of the replica mold and the degree of freedom of the shape (size) of the substrate to be processed, The existing technology does not satisfy all. In particular, there is still room for improvement in the photocurable composition used in the formation of resin molds for nanoimprint typified by replica molds.

本發明是鑑於所述情況而成者。具體而言,本發明的目的在於提供一種光硬化性組成物,其用於形成在作為複製模的適應中可重覆使用的樹脂模具。 [解決課題之手段]The present invention was made in view of the aforementioned circumstances. Specifically, the object of the present invention is to provide a photocurable composition for forming a resin mold that can be used repeatedly in adaptation as a replication mold. [Means to solve the problem]

本發明如下所述。The present invention is as follows.

1. 一種光硬化性組成物,其用於形成包括基板及樹脂層的凹凸結構體的該樹脂層,所述樹脂層設置於該基板上且表面形成有微細凹凸,並且所述光硬化性組成物中, 利用下述評價方法1所測定的表面自由能為15 mJ/m2 ~40 mJ/m2 , 利用下述評價方法2所測定的硬度為0.05 GPa~0.5 GPa。 (評價方法1) 首先,將光硬化性組成物塗佈於基板而形成光硬化性膜,照射紫外線而獲得經硬化的硬化膜。 其次,使用接觸角計分別測定水、二碘甲烷及1-溴萘相對於所述硬化膜的接觸角。 然後,根據Kitazaki-Hata的理論來算出表面自由能。 (評價方法2) 首先,利用與所述評價方法1相同的方法來獲得硬化膜。 其次,使用奈米壓痕儀(nanoindentor),將玻氏(Berkovich)壓頭壓抵於所述硬化膜,並根據所檢測出的應力的值來算出硬度。 2. 如1.所述的光硬化性組成物,其中, 該光硬化性組成物包含(a)光硬化性單體、或光硬化性單體與黏合劑樹脂及(b)具有光反應性官能基的添加劑, 相對於(a)光硬化性單體、或光硬化性單體與黏合劑樹脂及(b)具有光反應性官能基的添加劑的總量,(b)具有光反應性官能基的添加劑的含有率為0.001質量%~10質量%。 3. 如2.所述的光硬化性組成物,其中, 所述(b)具有光反應性官能基的添加劑包含下述通式(1)所表示的添加劑及/或含有以下通式(2)所表示的結構的添加劑。 [化1]

Figure 02_image001
通式(1)中, R1 相同或不同地表示選自由氫原子、氟原子、鹵素原子、碳數1~20的烴基、碳數6~20的芳基、碳數6~20的芳烷基、碳數1~20的聚醚基及碳數1~20的氟碳基所組成的群組中的任一原子或基, L1 的至少一個含有選自由環氧基、羥基、胺基、乙烯基醚基、內酯基、丙烯基醚基、烯烴基、氧雜環丁基、乙烯基、丙烯酸酯基、甲醇基及羧基所組成的群組中的光反應性官能基,於L1 並非光反應性官能基的情況下,相同或不同地表示選自所述R1 中的原子或基, n及1-n表示各單元的比率。 [化2]
Figure 02_image003
通式(2)中, L2 為選自由環氧基、胺基、乙烯基醚基、內酯基、丙烯基醚基、醇基、烯烴基、氧雜環丁基、乙烯基、丙烯酸酯基、甲醇基及羧基所組成的群組中的光反應性官能基, R2 ~R5 中的至少一個為選自由氟、含有氟的碳數1~10的烷基、含有氟的碳數1~10的烷氧基及含有氟的碳數2~10的烷氧基烷基所組成的群組中的含氟的基, 於R2 ~R5 並非含氟的基的情況下,R2 ~R5 為選自由氫、碳數1~10的烷基、碳數1~10的烷氧基及碳數2~10的烷氧基烷基所組成的群組中的有機基, R2 ~R5 可相同亦可不同,另外,R2 ~R5 可相互鍵結而形成環結構, 虛線表示該部分的鍵可為碳-碳單鍵亦可為碳-碳雙鍵。 4. 如1.至3.中任一項所述的光硬化性組成物,其包含光硬化起始劑。 5. 如2.或3.所述的光硬化性組成物,其中, 所述光硬化性單體包含具有能夠進行陽離子聚合的開環聚合性基的化合物。 6. 一種凹凸結構體的製造方法,其是使用如1.至5.中任一項所述的光硬化性組成物來製造凹凸結構體,所述凹凸結構體包括:基板;以及樹脂層,設置於該基板上且表面形成有微細凹凸,並且所述製造方法包括壓接步驟, 所述壓接步驟是將具有微細凹凸圖案的模具壓接於藉由所述光硬化性組成物而設置於基板上的光硬化性層,藉此於所述樹脂層的表面形成與所述微細凹凸圖案對應的微細凹凸圖案。 7. 如6.所述的凹凸結構體的製造方法,其更包括: 光照射步驟,於所述壓接步驟之後,於壓接所述模具的狀態下照射光,藉此使所述光硬化性層硬化而製成硬化層;以及 剝離步驟,自所述硬化層剝離所述模具。 8. 一種形成微細凹凸圖案的方法,其是重覆使用包括如下樹脂層的基板來形成微細凹凸圖案,所述樹脂層是由如1.至5.中任一項所述的光硬化性組成物形成且表面形成有微細凹凸。 9. 一種凹凸結構體,包括: 基板;以及 樹脂層,設置於該基板上,且由如1.至4.中任一項所述的光硬化性組成物形成,並且表面形成有微細凹凸。 [發明的效果]1. A photocurable composition for forming the resin layer of a concavo-convex structure including a substrate and a resin layer, the resin layer is provided on the substrate with fine concavities and convexities formed on the surface, and the photocurable composition Among them, the surface free energy measured by the following evaluation method 1 is 15 mJ/m 2 to 40 mJ/m 2 , and the hardness measured by the following evaluation method 2 is 0.05 GPa to 0.5 GPa. (Evaluation method 1) First, a photocurable composition is applied to a substrate to form a photocurable film, and ultraviolet rays are irradiated to obtain a cured cured film. Next, a contact angle meter was used to measure the contact angles of water, diiodomethane, and 1-bromonaphthalene with respect to the cured film. Then, calculate the surface free energy according to Kitazaki-Hata's theory. (Evaluation method 2) First, a cured film was obtained by the same method as the above-mentioned evaluation method 1. Next, a nanoindentor is used to press a Berkovich indenter against the hardened film, and the hardness is calculated based on the value of the detected stress. 2. The photocurable composition according to 1., wherein the photocurable composition contains (a) a photocurable monomer, or a photocurable monomer and a binder resin, and (b) has photoreactivity Functional group additives, with respect to the total amount of (a) photocurable monomers, or photocurable monomers and binder resins, and (b) additives with photoreactive functional groups, (b) have photoreactive functions The content rate of the base additive is 0.001% by mass to 10% by mass. 3. The photocurable composition according to 2., wherein the (b) additive having a photoreactive functional group includes an additive represented by the following general formula (1) and/or contains the following general formula (2) ) Additives of the structure indicated. [化1]
Figure 02_image001
In the general formula (1), R 1 is the same or different and represents selected from a hydrogen atom, a fluorine atom, a halogen atom, a hydrocarbon group having 1 to 20 carbons, an aryl group having 6 to 20 carbons, and an alkane having 6 to 20 carbons. Group, any atom or group in the group consisting of a polyether group with 1 to 20 carbons and a fluorocarbon group with 1 to 20 carbons , at least one of L 1 contains an epoxy group, a hydroxyl group, and an amino group , Vinyl ether group, lactone group, propenyl ether group, alkene group, oxetanyl group, vinyl group, acrylate group, methanol group and carboxyl group consisting of photoreactive functional group, in L 1 is not the case where the photoreactive functional group, the same or different, represent R 1 is selected from the atom or group, n and 1-n represents the ratio of the respective units. [化2]
Figure 02_image003
In the general formula (2), L 2 is selected from epoxy groups, amino groups, vinyl ether groups, lactone groups, propenyl ether groups, alcohol groups, alkene groups, oxetanyl groups, vinyl groups, and acrylate groups. At least one of R 2 to R 5 is selected from the group consisting of fluorine, fluorine-containing alkyl group having 1 to 10 carbon atoms, and fluorine-containing carbon number A fluorine-containing group in the group consisting of 1-10 alkoxy groups and fluorine-containing alkoxyalkyl groups having 2-10 carbon atoms. When R 2 to R 5 are not fluorine-containing groups, R 2 to R 5 are organic groups selected from the group consisting of hydrogen, alkyl groups having 1 to 10 carbons, alkoxy groups having 1 to 10 carbons, and alkoxyalkyl groups having 2 to 10 carbons, R 2 to R 5 may be the same or different. In addition, R 2 to R 5 may be bonded to each other to form a ring structure. The dotted line indicates that the bond in this part may be a carbon-carbon single bond or a carbon-carbon double bond. 4. The photocurable composition according to any one of 1. to 3. which contains a photocuring initiator. 5. The photocurable composition according to 2. or 3., wherein the photocurable monomer contains a compound having a ring-opening polymerizable group capable of undergoing cationic polymerization. 6. A method for manufacturing a concavo-convex structure, which uses the photocurable composition as described in any one of 1. to 5. to produce a concavo-convex structure, the concavo-convex structure comprising: a substrate; and a resin layer, Is provided on the substrate with fine concavities and convexities formed on the surface, and the manufacturing method includes a crimping step, wherein the crimping step is to crimp a mold having a fine concavo-convex pattern to the photocurable composition. The photocurable layer on the substrate thereby forms a fine concavo-convex pattern corresponding to the fine concavo-convex pattern on the surface of the resin layer. 7. The manufacturing method of the concavo-convex structure as described in 6., further comprising: a light irradiation step, after the crimping step, irradiating light in a state where the mold is crimped, thereby hardening the light The sexual layer is cured to form a hardened layer; and the peeling step is to peel off the mold from the hardened layer. 8. A method for forming a fine concavo-convex pattern, which is to repeatedly use a substrate comprising a resin layer to form the fine concavo-convex pattern, the resin layer being composed of the photocurable composition as described in any one of 1. to 5. The surface is formed with fine concavities and convexities. 9. A concavo-convex structure, comprising: a substrate; and a resin layer provided on the substrate and formed of the photocurable composition as described in any one of 1. to 4. with fine concavities and convexities formed on the surface. [Effects of the invention]

藉由使用本發明的光硬化性組成物,可獲得於作為複製模的適應中能夠重覆使用的凹凸結構體。By using the photocurable composition of the present invention, a concavo-convex structure that can be used repeatedly in adaptation as a replica mold can be obtained.

以下,對本發明的實施形態進行說明。 關於與數值範圍相關的「A~B」的記載,只要無特別說明,則表示A以上、B以下。例如,「1%~5%」的記載是指1%以上、5%以下。 於本說明書中,有時將本發明的光硬化性組成物表述為「第一光硬化性組成物」。另外,有時將如下光硬化性組成物表述為「第二光硬化性組成物」:使用該第一光硬化性組成物而將具有表面形成有微細凹凸結構的樹脂層的基板製成複製模,使用該複製模來加工被加工基板時所使用的光硬化性組成物。 關於本說明書中的基(原子團)的表述,未記載經取代或未經取代的表述包含不具有取代基的基與具有取代基的基這兩者。例如,所謂「烷基」,不僅包含不具有取代基的烷基(未經取代的烷基),而且亦包含具有取代基的烷基(經取代的烷基)。Hereinafter, an embodiment of the present invention will be described. The description of "A to B" related to the numerical range means more than A and less than B unless otherwise specified. For example, the description of "1% to 5%" means 1% or more and 5% or less. In this specification, the photocurable composition of the present invention may be expressed as the "first photocurable composition". In addition, the following photocurable composition is sometimes expressed as a "second photocurable composition": the first photocurable composition is used to form a substrate having a resin layer with a fine uneven structure formed on the surface thereof into a replica mold , Use the copy mold to process the photocurable composition used when processing the substrate to be processed. Regarding the expression of the group (atomic group) in this specification, the expression that does not describe substituted or unsubstituted includes both an unsubstituted group and a substituted group. For example, the term "alkyl" includes not only an unsubstituted alkyl group (unsubstituted alkyl group) but also a substituted alkyl group (substituted alkyl group).

<光硬化性組成物> 本實施形態的光硬化性組成物用於形成凹凸結構體中的樹脂層,所述凹凸結構體包括:基板;以及樹脂層,設置於該基板上且表面形成有微細凹凸。 本實施形態的光硬化性組成物較佳為包含(a)光硬化性單體或光硬化性單體與黏合劑樹脂、以及(b)具有光反應性官能基的添加劑。 而且,相對於(a)與(b)的總量,(b)具有光反應性官能基的添加劑的含有率較佳為0.001質量%~10質量%。 以下,對可構成光硬化性組成物的各成分進行說明。為了以防萬一而註明,本實施形態的光硬化性組成物較佳為包含以下所說明的成分,但只要利用後述的(評價方法1)及(評價方法2)所測定的特性值為規定的範圍內,則亦可不包含以下所說明的成分。<Light-curable composition> The photocurable composition of this embodiment is used to form a resin layer in a concavo-convex structure, the concavo-convex structure comprising: a substrate; and a resin layer provided on the substrate and having fine concavities and convexities formed on the surface. The photocurable composition of the present embodiment preferably contains (a) a photocurable monomer or a photocurable monomer and a binder resin, and (b) an additive having a photoreactive functional group. Moreover, it is preferable that the content rate of the additive which has a photoreactive functional group of (b) with respect to the total amount of (a) and (b) is 0.001 mass%-10 mass %. Hereinafter, each component that can constitute the photocurable composition will be described. Just in case, the photocurable composition of the present embodiment preferably contains the components described below, but it is only required that the characteristic values measured by (evaluation method 1) and (evaluation method 2) described later are specified Within the range of, the components described below may not be included.

(光硬化性單體) 作為光硬化性單體,可列舉具有反應性雙鍵基的化合物、能夠進行陽離子聚合的開環聚合性化合物等。特佳為硬化收縮小且凹凸形狀的尺寸再現性良好的、能夠進行陽離子聚合的開環聚合性化合物(具體而言為包含環氧基或氧雜環丁基等開環聚合性基的化合物)。(Photocurable monomer) As the photocurable monomer, a compound having a reactive double bond group, a ring-opening polymerizable compound capable of undergoing cationic polymerization, and the like can be cited. Particularly preferred is a ring-opening polymerizable compound (specifically, a compound containing a ring-opening polymerizable group such as epoxy group or oxetanyl group) that has small curing shrinkage and good dimensional reproducibility of uneven shapes and can undergo cationic polymerization. .

光硬化性單體可於一分子中具有一個反應性基,亦可具有多個。較佳為使用於一分子中具有兩個以上的反應性基的化合物。一分子中的反應性基的數量的上限並不特別存在,例如為兩個,較佳為四個。 作為光硬化性單體,可僅使用一種,亦可使用兩種以上。於使用兩種以上的情況下,可以任意的比例混合使用反應性基數量不同的化合物。另外,亦可以任意的比例混合使用具有反應性雙鍵基的化合物與能夠進行陽離子聚合的開環聚合性化合物。 另外,藉由適當選擇光硬化性單體的種類或組成比,可於光照射硬化後的內部及表面高效地形成三維網狀結構。藉此,可將後述的樹脂硬度保持為適當的範圍。The photocurable monomer may have one reactive group in one molecule, or may have a plurality of them. It is preferable to use a compound having two or more reactive groups in one molecule. The upper limit of the number of reactive groups in one molecule does not particularly exist, and for example, it is two, preferably four. As the photocurable monomer, only one type may be used, or two or more types may be used. When two or more types are used, compounds with different numbers of reactive groups can be mixed and used in any ratio. In addition, a compound having a reactive double bond group and a ring-opening polymerizable compound capable of cation polymerization may be mixed and used in an arbitrary ratio. In addition, by appropriately selecting the type or composition ratio of the photocurable monomer, a three-dimensional network structure can be efficiently formed on the inside and the surface after curing by light irradiation. Thereby, the resin hardness mentioned later can be maintained in an appropriate range.

作為光硬化性單體為具有反應性雙鍵基的化合物時的具體例,例如可列舉以下。 氟二烯(CF2 =CFOCF2 CF2 CF=CF2 、CF2 =CFOCF2 CF(CF3 )CF=CF2 、CF2 =CFCF2 C(OH)(CF3 )CH2 CH=CH2 、CF2 =CFCF2 C(OH)(CF3 )CH=CH2 、CF2 =CFCF2 C(CF3 )(OCH2 OCH3 )CH2 CH=CH2 、CF2 =CFCH2 C(C(CF3 )2 OH)(CF3 )CH2 CH=CH2 等)等烯烴類。 降冰片烯、降冰片二烯等環狀烯烴類。 環己基甲基乙烯基醚、異丁基乙烯基醚、環己基乙烯基醚、乙基乙烯基醚等烷基乙烯基醚類。 乙酸乙烯酯等乙烯基酯類。 (甲基)丙烯酸、丙烯酸苯氧基乙酯、丙烯酸苄酯、丙烯酸硬脂酯、丙烯酸月桂酯、丙烯酸-2-乙基己酯、丙烯酸烯丙酯、1,3-丁二醇二丙烯酸酯、1,4-丁二醇二丙烯酸酯、1,6-己二醇二丙烯酸酯、三羥甲基丙烷三丙烯酸酯、季戊四醇三丙烯酸酯、二季戊四醇六丙烯酸酯、丙烯酸乙氧基乙酯、丙烯酸甲氧基乙酯、丙烯酸縮水甘油酯、丙烯酸四氫糠酯、二乙二醇二丙烯酸酯、新戊二醇二丙烯酸酯、聚氧乙二醇二丙烯酸酯、三丙二醇二丙烯酸酯、丙烯酸-2-羥基乙酯、丙烯酸-2-羥基丙酯、4-羥基丁基乙烯基醚、丙烯酸-N,N-二乙基胺基乙酯、丙烯酸-N,N-二甲基胺基乙酯、N-乙烯基吡咯啶酮、甲基丙烯酸二甲基胺基乙酯、甲基丙烯酸甲酯、甲基丙烯酸三氟乙酯、甲基丙烯酸苄酯等(甲基)丙烯酸及其衍生物、或者該些的含氟的丙烯酸酯類、多官能丙烯酸酯類等。As a specific example when the photocurable monomer is a compound having a reactive double bond group, for example, the following can be cited. Fluorodiene (CF 2 =CFOCF 2 CF 2 CF=CF 2 , CF 2 =CFOCF 2 CF(CF 3 )CF=CF 2 , CF 2 =CFCF 2 C(OH)(CF 3 )CH 2 CH=CH 2 , CF 2 =CFCF 2 C(OH)(CF 3 )CH=CH 2 , CF 2 =CFCF 2 C(CF 3 )(OCH 2 OCH 3 )CH 2 CH=CH 2 , CF 2 =CFCH 2 C(C (CF 3 ) 2 OH)(CF 3 )CH 2 CH=CH 2 etc.) and other olefins. Cyclic olefins such as norbornene and norbornadiene. Alkyl vinyl ethers such as cyclohexyl methyl vinyl ether, isobutyl vinyl ether, cyclohexyl vinyl ether, and ethyl vinyl ether. Vinyl esters such as vinyl acetate. (Meth) acrylic acid, phenoxyethyl acrylate, benzyl acrylate, stearyl acrylate, lauryl acrylate, 2-ethylhexyl acrylate, allyl acrylate, 1,3-butanediol diacrylate , 1,4-butanediol diacrylate, 1,6-hexanediol diacrylate, trimethylolpropane triacrylate, pentaerythritol triacrylate, dipentaerythritol hexaacrylate, ethoxyethyl acrylate, Methoxyethyl acrylate, glycidyl acrylate, tetrahydrofurfuryl acrylate, diethylene glycol diacrylate, neopentyl glycol diacrylate, polyoxyethylene glycol diacrylate, tripropylene glycol diacrylate, acrylic acid 2-hydroxyethyl, 2-hydroxypropyl acrylate, 4-hydroxybutyl vinyl ether, -N,N-diethylaminoethyl acrylate, -N,N-dimethylaminoethyl acrylate Esters, N-vinylpyrrolidone, dimethylaminoethyl methacrylate, methyl methacrylate, trifluoroethyl methacrylate, benzyl methacrylate, etc. (meth)acrylic acid and its derivatives , Or these fluorine-containing acrylates, polyfunctional acrylates, etc.

光硬化性單體中,作為能夠進行陽離子聚合的開環聚合性化合物,例如可列舉以下。就長期的保存穩定性或抑制由硬化收縮引起的凹凸結構的尺寸精度惡化等方面而言,較佳為所述化合物。Among the photocurable monomers, examples of the ring-opening polymerizable compound capable of undergoing cationic polymerization include the following. In terms of long-term storage stability and suppression of deterioration in the dimensional accuracy of the uneven structure due to hardening shrinkage, etc., the compound is preferred.

1,7-丁二烯二環氧化物、1,2-環氧基癸烷、1,2-環氧基十二烷、2-乙基己基縮水甘油醚、環己烯環氧化物、α-蒎烯氧化物、二環戊二烯氧化物、檸檬烯單氧化物、檸檬烯二氧化物、4-乙烯基環己烯二氧化物、3,4-環氧基環己基甲基-3',4'-環氧基環己烷羧酸酯、二(3,4-環氧基環己基)己二酸、(3,4-環氧基環己基)甲醇、1,2-環氧基-4-乙烯基環己烷、(3,4-環氧基-6-甲基環己基)甲基-3,4-環氧基-6-甲基環己烷羧酸酯、乙烯1,2-二(3,4-環氧基環己烷羧酸)酯、甲基丙烯酸[(3,4-環氧基環己烷)-1-基]甲基、(3,4-環氧基環己基)乙基三甲氧基矽烷、2-乙基己基縮水甘油醚、苯基縮水甘油醚、二環己基-3,3'-二環氧化物、雙酚A型環氧樹脂、鹵化雙酚A型環氧樹脂、雙酚F型環氧樹脂、環氧化聚丁二烯、鄰甲酚酚醛清漆型環氧樹脂、間甲酚酚醛清漆型環氧樹脂、對甲酚酚醛清漆型環氧樹脂、苯酚酚醛清漆型環氧樹脂、多元醇的聚縮水甘油醚、2,2-雙(羥基甲基)-1-丁醇的1,2-環氧基-4-(2-氧雜環丙基)環己烷加成物、3,4-環氧基環己基甲基-3',4'-環氧基環己烷羧酸酯與ε-己內酯的加成物、己二酸雙(3,4-環氧基環己烷-1-基甲基)酯、3,4-環氧基環己烯基甲基-3',4'-環氧基環己烯羧酸酯等脂環式環氧樹脂或氫化雙酚A的縮水甘油醚、縮水甘油酯等的環氧化合物等環氧化合物類。 作為具有一個氧雜環丁基的化合物的3-甲基-3-(丁氧基甲基)氧雜環丁烷、3-甲基-3-(戊氧基甲基)氧雜環丁烷、3-甲基-3-(己氧基甲基)氧雜環丁烷、3-甲基-3-(2-乙基己氧基甲基)氧雜環丁烷、3-甲基-3-(辛氧基甲基)氧雜環丁烷、3-甲基-3-(癸醯氧基甲基)氧雜環丁烷、3-甲基-3-(十二烷醯氧基甲基)氧雜環丁烷、3-甲基-3-(苯氧基甲基)氧雜環丁烷、3-乙基-3-(丁氧基甲基)氧雜環丁烷、3-乙基-3-(戊氧基甲基)氧雜環丁烷、3-乙基-3-(己氧基甲基)氧雜環丁烷、3-乙基-3-(2-乙基己氧基甲基)氧雜環丁烷、3-乙基-3-(辛氧基甲基)氧雜環丁烷、3-乙基-3-(癸醯氧基甲基)氧雜環丁烷、3-乙基-3-(十二烷醯氧基甲基)氧雜環丁烷、3-(環己氧基甲基)氧雜環丁烷、3-甲基-3-(環己氧基甲基)氧雜環丁烷、3-乙基-3-(環己氧基甲基)氧雜環丁烷、3-乙基-3-(苯氧基甲基)氧雜環丁烷、3,3-二甲基氧雜環丁烷、3-羥基甲基氧雜環丁烷、3-甲基-3-羥基甲基氧雜環丁烷、3-乙基-3-羥基甲基氧雜環丁烷、3-乙基-3-苯氧基甲基氧雜環丁烷、3-正丙基-3-羥基甲基氧雜環丁烷、3-異丙基-3-羥基甲基氧雜環丁烷、3-正丁基-3-羥基甲基氧雜環丁烷、3-異丁基-3-羥基甲基氧雜環丁烷、3-第二丁基-3-羥基甲基氧雜環丁烷、3-第三丁基-3-羥基甲基氧雜環丁烷、3-乙基-3-(2-乙基己基)氧雜環丁烷、3-乙基-3-[(2-乙基己基氧基)甲基]氧雜環丁烷等,作為具有兩個以上的氧雜環丁基的化合物的雙(3-乙基-3-氧雜環丁基甲基)醚、1,2-雙[(3-乙基-3-氧雜環丁基甲氧基)]乙烷、1,3-雙[(3-乙基-3-氧雜環丁基甲氧基)]丙烷、1,3-雙[(3-乙基-3-氧雜環丁基甲氧基)]-2,2-二甲基-丙烷、1,4-雙(3-乙基-3-氧雜環丁基甲氧基)丁烷、1,6-雙(3-乙基-3-氧雜環丁基甲氧基)己烷、1,4-雙[(3-甲基-3-氧雜環丁基)甲氧基]苯、1,3-雙[(3-甲基-3-氧雜環丁基)甲氧基]苯、1,4-雙{[(3-甲基-3-氧雜環丁基)甲氧基]甲基}苯、1,4-雙{[(3-甲基-3-氧雜環丁基)甲氧基]甲基}環己烷、4,4'-雙{[(3-甲基-3-氧雜環丁基)甲氧基]甲基}聯苯、4,4'-雙{[(3-甲基-3-氧雜環丁基)甲氧基]甲基}雙環己烷、2,3-雙[(3-甲基-3-氧雜環丁基)甲氧基]雙環[2.2.1]庚烷、2,5-雙[(3-甲基-3-氧雜環丁基)甲氧基]雙環[2.2.1]庚烷、2,6-雙[(3-甲基-3-氧雜環丁基)甲氧基]雙環[2.2.1]庚烷、1,4-雙[(3-乙基-3-氧雜環丁基)甲氧基]苯、1,3-雙[(3-乙基-3-氧雜環丁基)甲氧基]苯、1,4-雙{[(3-乙基-3-氧雜環丁基)甲氧基]甲基}苯、1,4-雙{[(3-乙基-3-氧雜環丁基)甲氧基]甲基}環己烷、4,4'-雙{[(3-乙基-3-氧雜環丁基)甲氧基]甲基}聯苯、4,4'-雙{[(3-乙基-3-氧雜環丁基)甲氧基]甲基}雙環己烷、2,3-雙[(3-乙基-3-氧雜環丁基)甲氧基]雙環[2.2.1]庚烷、2,5-雙[(3-乙基-3-氧雜環丁基)甲氧基]雙環[2.2.1]庚烷、2,6-雙[(3-乙基-3-氧雜環丁基)甲氧基]雙環[2.2.1]庚烷、伸二甲苯基雙氧雜環丁烷等氧雜環丁烷化合物類。 內酯化合物類。 丙烯基醚化合物類等。1,7-butadiene diepoxide, 1,2-epoxydecane, 1,2-epoxydodecane, 2-ethylhexyl glycidyl ether, cyclohexene epoxide, α -Pinene oxide, dicyclopentadiene oxide, limonene monooxide, limonene dioxide, 4-vinylcyclohexene dioxide, 3,4-epoxycyclohexylmethyl-3', 4'-Epoxycyclohexane carboxylate, bis(3,4-epoxycyclohexyl)adipic acid, (3,4-epoxycyclohexyl)methanol, 1,2-epoxy- 4-vinylcyclohexane, (3,4-epoxy-6-methylcyclohexyl) methyl-3,4-epoxy-6-methylcyclohexane carboxylate, ethylene1,2 -Bis(3,4-epoxycyclohexanecarboxylic acid) ester, methacrylic acid [(3,4-epoxycyclohexane)-1-yl]methyl, (3,4-epoxy) Cyclohexyl) ethyl trimethoxysilane, 2-ethylhexyl glycidyl ether, phenyl glycidyl ether, dicyclohexyl-3,3'-diepoxide, bisphenol A epoxy resin, halogenated bisphenol A type epoxy resin, bisphenol F type epoxy resin, epoxidized polybutadiene, o-cresol novolak type epoxy resin, m-cresol novolak type epoxy resin, p-cresol novolak type epoxy resin , Phenol novolac type epoxy resin, polyglycidyl ether of polyol, 1,2-epoxy-4-(2-oxane) of 2,2-bis(hydroxymethyl)-1-butanol Base) cyclohexane adduct, 3,4-epoxycyclohexylmethyl-3',4'-epoxycyclohexane carboxylate and ε-caprolactone adduct, adipic acid Bis(3,4-epoxycyclohexane-1-ylmethyl) ester, 3,4-epoxycyclohexenylmethyl-3',4'-epoxycyclohexene carboxylate Epoxy compounds such as alicyclic epoxy resins or epoxy compounds such as glycidyl ethers and glycidyl esters of hydrogenated bisphenol A. 3-methyl-3-(butoxymethyl)oxetane, 3-methyl-3-(pentyloxymethyl)oxetane as a compound with one oxetanyl group , 3-methyl-3-(hexyloxymethyl)oxetane, 3-methyl-3-(2-ethylhexyloxymethyl)oxetane, 3-methyl- 3-(octyloxymethyl)oxetane, 3-methyl-3-(decanoyloxymethyl)oxetane, 3-methyl-3-(dodecanoyloxy) Methyl)oxetane, 3-methyl-3-(phenoxymethyl)oxetane, 3-ethyl-3-(butoxymethyl)oxetane, 3 -Ethyl-3-(pentyloxymethyl)oxetane, 3-ethyl-3-(hexyloxymethyl)oxetane, 3-ethyl-3-(2-ethyl Hexyloxymethyl)oxetane, 3-ethyl-3-(octyloxymethyl)oxetane, 3-ethyl-3-(decyloxymethyl)oxetane Cyclobutane, 3-ethyl-3-(dodecyloxymethyl)oxetane, 3-(cyclohexyloxymethyl)oxetane, 3-methyl-3- (Cyclohexyloxymethyl)oxetane, 3-ethyl-3-(cyclohexyloxymethyl)oxetane, 3-ethyl-3-(phenoxymethyl)oxy Etidine, 3,3-dimethyloxetane, 3-hydroxymethyloxetane, 3-methyl-3-hydroxymethyloxetane, 3-ethyl- 3-hydroxymethyloxetane, 3-ethyl-3-phenoxymethyloxetane, 3-n-propyl-3-hydroxymethyloxetane, 3-isopropyl 3-hydroxymethyloxetane, 3-n-butyl-3-hydroxymethyloxetane, 3-isobutyl-3-hydroxymethyloxetane, 3-th Dibutyl-3-hydroxymethyloxetane, 3-tert-butyl-3-hydroxymethyloxetane, 3-ethyl-3-(2-ethylhexyl)oxetane Butane, 3-ethyl-3-[(2-ethylhexyloxy)methyl]oxetane, etc., bis(3-ethyl) as a compound having two or more oxetanyl groups -3-oxetanylmethyl) ether, 1,2-bis[(3-ethyl-3-oxetanylmethoxy)]ethane, 1,3-bis[(3-ethyl-3- Oxetanylmethoxy)]propane, 1,3-bis[(3-ethyl-3-oxetanylmethoxy)]-2,2-dimethyl-propane, 1,4-bis(3 -Ethyl-3-oxetanylmethoxy)butane, 1,6-bis(3-ethyl-3-oxetanylmethoxy)hexane, 1,4-bis[(3-methyl -3-oxetanyl)methoxy]benzene, 1,3-bis[(3-methyl-3-oxetanyl)methoxy]benzene, 1,4-bis{[(3 -Methyl-3-oxetanyl)methoxy]methyl}benzene, 1,4-bis{[(3-methyl-3-oxetanyl)methoxy]methyl} ring Hexane, 4,4'-bis{[(3-methyl-3-oxetanyl)methoxy]methyl}biphenyl, 4,4'-bis{[(3-methyl-3 -Oxetanyl)methoxy)methyl)bis Cyclohexane, 2,3-bis[(3-methyl-3-oxetanyl)methoxy]bicyclo[2.2.1]heptane, 2,5-bis[(3-methyl-3 -Oxetanyl)methoxy]bicyclo[2.2.1]heptane, 2,6-bis[(3-methyl-3-oxetanyl)methoxy]bicyclo[2.2.1] Heptane, 1,4-bis[(3-ethyl-3-oxetanyl)methoxy]benzene, 1,3-bis[(3-ethyl-3-oxetanyl)methan Oxy]benzene, 1,4-bis{[(3-ethyl-3-oxetanyl)methoxy]methyl}benzene, 1,4-bis{[(3-ethyl-3- Oxetanyl)methoxy]methyl}cyclohexane, 4,4'-bis{[(3-ethyl-3-oxetanyl)methoxy]methyl}biphenyl, 4 ,4'-Bis{[(3-ethyl-3-oxetanyl)methoxy]methyl}bicyclohexane, 2,3-bis[(3-ethyl-3-oxetan Yl)methoxy]bicyclo[2.2.1]heptane, 2,5-bis[(3-ethyl-3-oxetanyl)methoxy]bicyclo[2.2.1]heptane, 2, Oxetane compounds such as 6-bis[(3-ethyl-3-oxetanyl)methoxy]bicyclo[2.2.1]heptane and xylylene dioxetane. Lactone compounds. Allyl ether compounds, etc.

於以光硬化性組成物整體為基準(100質量%)時,光硬化性組成物中的光硬化性單體的含量較佳為10質量%~99.5質量%,更佳為20質量%~99.5質量%,進而佳為30質量%~99.5質量%。另外,於包含後述的黏合劑樹脂的情況下,較佳為50質量%~99.5質量%,更佳為60質量%~99.5質量%,進而佳為70質量%~99.5質量%。於任一情況下,均可單獨使用光硬化性單體,亦可混合使用兩種以上。 藉由將光硬化性單體的含量調整為所述範圍,可於硬化後的樹脂層的表面及/或內部有效地形成三維網狀結構。而且,容易將後述的樹脂硬度調整為適當的範圍。On the basis of the entire photocurable composition (100% by mass), the content of the photocurable monomer in the photocurable composition is preferably 10% by mass to 99.5% by mass, more preferably 20% by mass to 99.5% by mass. % By mass, more preferably 30% by mass to 99.5% by mass. In addition, when the binder resin described later is included, it is preferably 50% by mass to 99.5% by mass, more preferably 60% by mass to 99.5% by mass, and still more preferably 70% by mass to 99.5% by mass. In either case, the photocurable monomer may be used alone, or two or more of them may be mixed and used. By adjusting the content of the photocurable monomer to the above range, a three-dimensional network structure can be effectively formed on the surface and/or inside of the cured resin layer. Moreover, it is easy to adjust the resin hardness mentioned later to an appropriate range.

(黏合劑樹脂) 黏合劑樹脂例如是指將所述光硬化性單體預先聚合而成的聚合物或利用其他方法聚合而成的聚合物。 就與硬化性單體的相容性或硬化後的膜物性等觀點而言,作為黏合劑樹脂,例如較佳為將所述光硬化性單體預先聚合而成的聚合物或非晶性的環狀烯烴聚合物。 另外,作為較佳的黏合劑樹脂,亦可列舉:聚丙烯酸樹脂、聚醚樹脂、聚氧雜環丁基樹脂、聚酯樹脂、環狀烯烴聚合物等。 作為環狀烯烴聚合物的例子,可列舉日本專利第5466705號公報的通式(1)所表示的含氟的環狀烯烴聚合物。該含氟的環狀烯烴聚合物與通常的氟樹脂不同,因氟原子及含氟的取代基的配置的特徵而具有適度的偶極矩。因此,在具有作為氟樹脂的特徵的同時,存在與通用的有機溶劑或光硬化性組成物中的其他成分的親和性良好的傾向。因此,具有如下優點:於製備組成物時均勻溶解;即使是光照射硬化後的形態,相容性亦良好;不會引起白化等而可獲得均勻透明的硬化樹脂層等。(Adhesive resin) The binder resin refers to, for example, a polymer obtained by polymerizing the photocurable monomer in advance or a polymer polymerized by other methods. From the viewpoints of compatibility with curable monomers and physical properties of the film after curing, the binder resin is preferably, for example, a polymer prepared by prepolymerizing the photocurable monomer or an amorphous resin. Cyclic olefin polymer. In addition, as preferred binder resins, polyacrylic resins, polyether resins, polyoxetanyl resins, polyester resins, cyclic olefin polymers, and the like can also be cited. As an example of the cyclic olefin polymer, a fluorine-containing cyclic olefin polymer represented by the general formula (1) of Japanese Patent No. 5466705 can be cited. This fluorine-containing cyclic olefin polymer is different from general fluororesins in that it has a moderate dipole moment due to the characteristics of the arrangement of fluorine atoms and fluorine-containing substituents. Therefore, while having characteristics as a fluororesin, there is a tendency that it has good affinity with general-purpose organic solvents or other components in the photocurable composition. Therefore, it has the following advantages: uniform dissolution during the preparation of the composition; good compatibility even in the form hardened by light irradiation; no whitening and the like are caused, and a uniform and transparent hardened resin layer and the like can be obtained.

於使用黏合劑樹脂的情況下,於以光硬化性組成物整體為基準(100質量%)時,所述黏合劑樹脂的量較佳為0.1質量%~50質量%,更佳為0.5質量%~40質量%,進而佳為1質量%~30質量%。於使用黏合劑樹脂的情況下,可單獨使用,亦可混合使用兩種以上。 藉由將黏合劑樹脂的含量調整為所述範圍,可調整光硬化性組成物的黏度。例如,可增強黏度來抑制塗敷時的流掛,或者改善由塗敷面的波動引起的均勻性的不良情況。In the case of using a binder resin, the amount of the binder resin is preferably 0.1% by mass to 50% by mass, more preferably 0.5% by mass based on the entire photocurable composition (100% by mass) ~40% by mass, more preferably 1% by mass to 30% by mass. In the case of using a binder resin, it can be used alone or in combination of two or more. By adjusting the content of the binder resin within the above range, the viscosity of the photocurable composition can be adjusted. For example, the viscosity can be increased to suppress sag during coating, or to improve uniformity problems caused by fluctuations in the coating surface.

就與光硬化性組成物中的其他成分的相容性的觀點而言,黏合劑樹脂的重量平均分子量以聚苯乙烯標準的凝膠滲透層析(Gel Permeation Chromatography,GPC)測定值計較佳為500~100000,更佳為500~80000,進而佳為500~50000。藉由將黏合劑樹脂的重量平均分子量調整為該範圍,與光硬化性組成物中的其他成分的相容性良好,容易獲得可長期穩定保管的光硬化性組成物。From the standpoint of compatibility with other components in the photocurable composition, the weight average molecular weight of the binder resin is preferably calculated as a value measured by gel permeation chromatography (Gel Permeation Chromatography, GPC) of a polystyrene standard 500 to 100,000, more preferably 500 to 80,000, still more preferably 500 to 50,000. By adjusting the weight average molecular weight of the binder resin to this range, compatibility with other components in the photocurable composition is good, and it is easy to obtain a photocurable composition that can be stored stably for a long period of time.

(具有光反應性官能基的添加劑) 具有光反應性官能基的添加劑較佳為於將本實施形態的光硬化性組成物製成膜時偏向存在於所述膜表面。藉此,可調整後述的硬化膜表面的表面自由能。(Additives with photoreactive functional groups) The additive having a photoreactive functional group is preferably present on the surface of the film when the photocurable composition of the present embodiment is formed into a film. Thereby, the surface free energy of the cured film surface mentioned later can be adjusted.

具有光反應性官能基的添加劑較佳為藉由光反應性官能基的存在而可與所述光硬化性單體結合的化合物。藉此,於複製模的重覆使用中,可抑制複製模的一部分向被加工基板的加工中所使用的第二光硬化性組成物移行,容易將複製模的表面性狀保持得良好。即,可提高複製模的重覆使用性。 另外,具有光反應性官能基的添加劑較佳為於形成樹脂層時偏向存在於表面。根據本發明者等人的發現,例如後述的矽氧烷化合物或具有特定的環狀結構的氟聚合物藉由矽原子或氟原子的存在等而有效地偏向存在於膜表面附近。藉此,可控制膜表面的表面自由能或硬度。而且,認為複製模的重覆使用性提高。The additive having a photoreactive functional group is preferably a compound that can be combined with the photocurable monomer due to the presence of the photoreactive functional group. Thereby, in the repeated use of the copy mold, a part of the copy mold can be prevented from migrating to the second photocurable composition used in the processing of the substrate to be processed, and the surface properties of the copy mold can be easily maintained in good condition. That is, the reusability of the copy mold can be improved. In addition, the additive having a photoreactive functional group is preferably present on the surface when the resin layer is formed. According to the findings of the present inventors, for example, the siloxane compound described later or the fluoropolymer having a specific cyclic structure is effectively biased in the vicinity of the film surface due to the presence of silicon atoms or fluorine atoms. Thereby, the surface free energy or hardness of the film surface can be controlled. Furthermore, it is considered that the reusability of the replica mold is improved.

作為具有光反應性官能基的添加劑,可列舉作為光反應性官能基而具有反應性雙鍵基的化合物、作為光反應性官能基而具有能夠進行陽離子聚合的開環聚合性基的化合物等。較佳為以能夠進行陽離子聚合的開環聚合性化合物(具體而言為環氧基、氧雜環丁基、胺基、乙烯基醚基、醇基等開環聚合性基,或者可與開環聚合性基直接鍵結的化合物)為宜。Examples of the additive having a photoreactive functional group include a compound having a reactive double bond group as a photoreactive functional group, a compound having a ring-opening polymerizable group capable of cation polymerization as a photoreactive functional group, and the like. It is preferably a ring-opening polymerizable compound capable of undergoing cationic polymerization (specifically, a ring-opening polymerizable group such as an epoxy group, an oxetanyl group, an amino group, a vinyl ether group, an alcohol group, etc. A compound in which a cyclic polymerizable group is directly bonded) is preferred.

具有光反應性官能基的添加劑可於一分子中具有一個光反應性基,亦可具有多個。具有光反應性官能基的添加劑較佳為於一分子中具有兩個以上的光反應性基。一分子中的反應性基的數量的上限並不特別存在,例如為兩個,較佳為四個。The additive having a photoreactive functional group may have one photoreactive group in one molecule, or may have a plurality of them. The additive having a photoreactive functional group preferably has two or more photoreactive groups in one molecule. The upper limit of the number of reactive groups in one molecule does not particularly exist, and for example, it is two, preferably four.

關於具有光反應性官能基的添加劑,可僅使用一種,亦可使用兩種以上。於使用兩種以上的情況下,可以任意的比例混合使用反應性基數量不同的化合物。另外,亦可以任意的比例混合使用具有反應性雙鍵基的化合物與能夠進行陽離子聚合的開環聚合性化合物。Regarding the additive having a photoreactive functional group, only one type may be used, or two or more types may be used. When two or more types are used, compounds with different numbers of reactive groups can be mixed and used in any ratio. In addition, a compound having a reactive double bond group and a ring-opening polymerizable compound capable of cation polymerization may be mixed and used in an arbitrary ratio.

光硬化性組成物中,相對於(a)光硬化性單體或光硬化性單體與黏合劑樹脂、以及(b)具有光反應性官能基的添加劑的總量(100質量%),具有光反應性官能基的添加劑的含有率較佳為0.001質量%~10質量%,更佳為0.005質量%~8質量%,進而佳為0.01質量%~5質量%。 藉由將量調整為該範圍,例如,可使添加劑高效地偏向存在於膜表面。而且,容易將後述的表面自由能調整為適當的範圍。而且,於凹凸結構體的製造中,於剝離步驟中抑制樹脂附著而提高剝離性。另外,可抑制複製模的缺陷並提高重覆使用性。In the photocurable composition, relative to the total amount (100% by mass) of (a) the photocurable monomer or the photocurable monomer and the binder resin, and (b) the additive having a photoreactive functional group The content of the photoreactive functional group additive is preferably 0.001% by mass to 10% by mass, more preferably 0.005% by mass to 8% by mass, and still more preferably 0.01% by mass to 5% by mass. By adjusting the amount to this range, for example, the additive can be efficiently distributed on the film surface. Furthermore, it is easy to adjust the surface free energy described later to an appropriate range. Furthermore, in the production of the uneven structure, the adhesion of the resin is suppressed in the peeling step to improve the peelability. In addition, the defects of the copy mold can be suppressed and the reusability can be improved.

作為具有光反應性官能基的添加劑的一例,可列舉具有光反應性官能基的矽氧烷化合物。更具體而言,可列舉以下通式(1)的矽氧烷化合物。As an example of the additive having a photoreactive functional group, a siloxane compound having a photoreactive functional group can be cited. More specifically, the siloxane compound of the following general formula (1) can be cited.

[化3]

Figure 02_image001
[化3]
Figure 02_image001

通式(1)中, R1 相同或不同地表示選自由氫原子、氟原子、鹵素原子、碳數1~20的烴基、碳數6~20的芳基、碳數6~20的芳烷基、碳數1~20的聚醚基及碳數1~20的氟碳基所組成的群組中的任一原子或基, L1 的至少一個含有選自由環氧基、羥基、胺基、乙烯基醚基、內酯基、丙烯基醚基、烯烴基、氧雜環丁基、乙烯基、丙烯酸酯基、甲醇基及羧基所組成的群組中的光反應性官能基,於L1 並非光反應性官能基的情況下,相同或不同地表示選自R1 中的原子或基, n及1-n表示各單元的比率,通常,n表示0~1的範圍。In the general formula (1), R 1 is the same or different and represents selected from a hydrogen atom, a fluorine atom, a halogen atom, a hydrocarbon group having 1 to 20 carbons, an aryl group having 6 to 20 carbons, and an alkane having 6 to 20 carbons. Group, any atom or group in the group consisting of a polyether group with 1 to 20 carbons and a fluorocarbon group with 1 to 20 carbons , at least one of L 1 contains an epoxy group, a hydroxyl group, and an amino group , Vinyl ether group, lactone group, propenyl ether group, alkene group, oxetanyl group, vinyl group, acrylate group, methanol group and carboxyl group consisting of photoreactive functional group, in L 1 is not the case where the photoreactive functional group, selected from the same or different in R 1 represent an atom or group, n and 1-n represents the ratio of the units, typically, it represents a range of 0 to n-1.

作為具有光反應性官能基的矽氧烷化合物,可使用市售品。例如,可自市售的含反應性基的矽氧烷化合物等中選擇主鏈末端/側鏈具有光反應性官能基的聚矽氧烷、相當於通式(1)的化合物等來使用。 作為含環氧基的矽氧烷化合物的市售品,例如可列舉:X-22-343(信越矽酮(silicone)公司製造)、KF-101(信越矽酮(silicone)公司製造)、KF-1001(信越矽酮(silicone)公司製造)、X-22-2000(信越矽酮(silicone)公司製造)、X-22-2046(信越矽酮(silicone)公司製造)、KF-102(信越矽酮(silicone)公司製造)、X-22-4741(信越矽酮(silicone)公司製造)、KF-1002(信越矽酮(silicone)公司製造)、X-22-3000T(信越矽酮(silicone)公司製造)、X-22-163(信越矽酮(silicone)公司製造)、KF-105(信越矽酮(silicone)公司製造)、X-22-163A(信越矽酮(silicone)公司製造)、X-22-163B(信越矽酮(silicone)公司製造)、X-22-163C(信越矽酮(silicone)公司製造)、X-22-169AS(信越矽酮(silicone)公司製造)、X-22-169B(信越矽酮(silicone)公司製造)、X-22-173DX(信越矽酮(silicone)公司製造)、X-22-9002(信越矽酮(silicone)公司製造)、SF 8411(東麗道康寧(Toray-Dow corning)公司製造)、SF 8413(東麗道康寧(Toray-Dow corning)公司製造)、SF 8421(東麗道康寧(Toray-Dow corning)公司製造)、BY16-839(東麗道康寧(Toray-Dow corning)公司製造)、BY16-876(東麗道康寧(Toray-Dow corning)公司製造)、FZ-3736(東麗道康寧(Toray-Dow corning)公司製造)等。As the siloxane compound having a photoreactive functional group, a commercially available product can be used. For example, a polysiloxane having a photoreactive functional group at the main chain end/side chain, a compound corresponding to the general formula (1), etc. can be selected from commercially available reactive group-containing silicone compounds and the like, and used. Commercial products of epoxy-containing silicone compounds include, for example, X-22-343 (manufactured by Shin-Etsu Silicone Co., Ltd.), KF-101 (manufactured by Shin-Etsu Silicone Co., Ltd.), and KF -1001 (manufactured by Shin-Etsu silicone company), X-22-2000 (manufactured by Shin-Etsu silicone company), X-22-2046 (manufactured by Shin-Etsu silicone company), KF-102 (manufactured by Shin-Etsu Silicone (manufactured by silicone company), X-22-4741 (manufactured by Shin-Etsu silicone company), KF-1002 (manufactured by Shin-Etsu silicone company), X-22-3000T (manufactured by Shin-Etsu silicone ) Company manufacture), X-22-163 (manufactured by Shin-Etsu Silicone Company), KF-105 (manufactured by Shin-Etsu Silicone Company), X-22-163A (manufactured by Shin-Etsu Silicone Company) , X-22-163B (manufactured by Shin-Etsu Silicone Company), X-22-163C (manufactured by Shin-Etsu Silicone Company), X-22-169AS (manufactured by Shin-Etsu Silicone Company), X -22-169B (manufactured by Shin-Etsu Silicone Company), X-22-173DX (manufactured by Shin-Etsu Silicone Company), X-22-9002 (manufactured by Shin-Etsu Silicone Company), SF 8411 ( Toray-Dow Corning (Toray-Dow Corning), SF 8413 (Toray-Dow Corning), SF 8421 (Toray-Dow Corning), BY16-839 (Toray-Dow Corning), BY16-839 Toray-Dow Corning (Toray-Dow Corning), BY16-876 (Toray-Dow Corning), FZ-3736 (Toray-Dow Corning), etc.

作為含羥基的矽氧烷化合物的市售品,具體而言,例如可列舉:YF3800(日本邁圖高新材料(Momentive Performance Materials Japan)有限責任公司製造)、XF3905(日本邁圖高新材料(Momentive Performance Materials Japan)有限責任公司製造)、X-21-5841(信越矽酮(silicone)公司製造)、KF-9701(信越矽酮(silicone)公司製造)、FM-0411(捷恩智(JNC)公司製造)、FM-0421(捷恩智(JNC)公司製造)、FM-0425(捷恩智(JNC)公司製造)、FM-DA11(捷恩智(JNC)公司製造)、FM-DA21(捷恩智(JNC)公司製造)、FM-DA26(捷恩智(JNC)公司製造)、FM-4411(捷恩智(JNC)公司製造)、FM-4421(捷恩智(JNC)公司製造)、FM-4425(捷恩智(JNC)公司製造)等。As commercially available products of hydroxyl-containing silicone compounds, specifically, for example, YF3800 (manufactured by Momentive Performance Materials Japan Co., Ltd.), XF3905 (made by Momentive Performance Materials Japan Co., Ltd.), XF3905 (Momentive Performance Materials Japan Materials Japan Co., Ltd.), X-21-5841 (manufactured by Shin-Etsu Silicone), KF-9701 (manufactured by Shin-Etsu Silicone), FM-0411 (manufactured by JNC) ), FM-0421 (manufactured by JNC), FM-0425 (manufactured by JNC), FM-DA11 (manufactured by JNC), FM-DA21 (manufactured by JNC) Company manufacturing), FM-DA26 (manufactured by JNC), FM-4411 (manufactured by JNC), FM-4421 (manufactured by JNC), FM-4425 (manufactured by JNC), JNC) manufactured by the company) and so on.

作為含胺基的矽氧烷化合物的市售品,例如可列舉:KF-868(信越矽酮(silicone)公司製造)、KF-865(信越矽酮(silicone)公司製造)、KF-864(信越矽酮(silicone)公司製造)、KF-859(信越矽酮(silicone)公司製造)、KF-393(信越矽酮(silicone)公司製造)、KF-860(信越矽酮(silicone)公司製造)、KF-880(信越矽酮(silicone)公司製造)、KF-8004(信越矽酮(silicone)公司製造)、KF-8002(信越矽酮(silicone)公司製造)、KF-8005(信越矽酮(silicone)公司製造)、KF-862(信越矽酮(silicone)公司製造)、X-223820W(信越矽酮(silicone)公司製造)、KF-869(信越矽酮(silicone)公司製造)、KF-861(信越矽酮(silicone)公司製造)、X-22-3939A(信越矽酮(silicone)公司製造)、KF-877(信越矽酮(silicone)公司製造)、PAM-E(信越矽酮(silicone)公司製造)、KF-8010(信越矽酮(silicone)公司製造)、X-22-161A(信越矽酮(silicone)公司製造)、X-22-161B(信越矽酮(silicone)公司製造)、KF-8012(信越矽酮(silicone)公司製造)、KF-8008(信越矽酮(silicone)公司製造)、X-22-1660B-3(信越矽酮(silicone)公司製造)、KF-857(信越矽酮(silicone)公司製造)、KF-8001(信越矽酮(silicone)公司製造)、KF-862(信越矽酮(silicone)公司製造)、X-22-9192(信越矽酮(silicone)公司製造)、KF-868(信越矽酮(silicone)公司製造)等。As commercially available products of amine group-containing silicone compounds, for example, KF-868 (manufactured by Shin-Etsu Silicone Co., Ltd.), KF-865 (manufactured by Shin-Etsu Silicone Co., Ltd.), and KF-864 ( Shin-Etsu Silicone (manufactured by Shin-Etsu Silicone), KF-859 (manufactured by Shin-Etsu Silicone), KF-393 (manufactured by Shin-Etsu Silicone), KF-860 (manufactured by Shin-Etsu Silicone) ), KF-880 (manufactured by Shin-Etsu Silicone), KF-8004 (manufactured by Shin-Etsu Silicone), KF-8002 (manufactured by Shin-Etsu Silicone), KF-8005 (manufactured by Shin-Etsu Silicone) (Made by silicone company), KF-862 (manufactured by Shin-Etsu silicone company), X-223820W (manufactured by Shin-Etsu silicone company), KF-869 (manufactured by Shin-Etsu silicone company), KF-861 (manufactured by Shin-Etsu Silicone), X-22-3939A (manufactured by Shin-Etsu Silicone), KF-877 (manufactured by Shin-Etsu Silicone), PAM-E (manufactured by Shin-Etsu Silicone) (Manufactured by silicone), KF-8010 (manufactured by Shin-Etsu Silicone), X-22-161A (manufactured by Shin-Etsu Silicone), X-22-161B (manufactured by Shin-Etsu Silicone) Manufactured by the company), KF-8012 (manufactured by Shin-Etsu silicone company), KF-8008 (manufactured by Shin-Etsu silicone company), X-22-1660B-3 (manufactured by Shin-Etsu silicone company), KF-857 (manufactured by Shin-Etsu Silicone), KF-8001 (manufactured by Shin-Etsu Silicone), KF-862 (manufactured by Shin-Etsu Silicone), X-22-9192 (manufactured by Shin-Etsu Silicone) (Made by silicone company), KF-868 (made by Shin-Etsu silicone company), etc.

作為含甲醇基的矽氧烷化合物的市售品,例如可列舉:X-22-4039(信越矽酮(silicone)公司製造)、X-22-4015(信越矽酮(silicone)公司製造)、X-22-160AS(信越矽酮(silicone)公司製造)、KF-6001(信越矽酮(silicone)公司製造)、KF-6002(信越矽酮(silicone)公司製造)、KF-6003(信越矽酮(silicone)公司製造)、X-22-170BX(信越矽酮(silicone)公司製造)、X-22-170DX(信越矽酮(silicone)公司製造)等。As commercial products of the methanol group-containing silicone compound, for example, X-22-4039 (manufactured by Shin-Etsu Silicone Co., Ltd.), X-22-4015 (manufactured by Shin-Etsu Silicone Co., Ltd.), X-22-160AS (manufactured by Shin-Etsu Silicone), KF-6001 (manufactured by Shin-Etsu Silicone), KF-6002 (manufactured by Shin-Etsu Silicone), KF-6003 (manufactured by Shin-Etsu Silicone) (Manufactured by silicone company), X-22-170BX (manufactured by Shin-Etsu silicone company), X-22-170DX (manufactured by Shin-Etsu silicone company), etc.

作為含羧基的矽氧烷化合物的市售品,例如可列舉:X-22-3701E(信越矽酮(silicone)公司製造)、X-22-162C(信越矽酮(silicone)公司製造)或X-22-3710(信越矽酮(silicone)公司製造)等。 作為含丙烯酸酯基的矽氧烷化合物的市售品,例如可列舉:X-22-164(信越矽酮(silicone)公司製造)、X-22-174BX(信越矽酮(silicone)公司製造)、X-22-2426(信越矽酮(silicone)公司製造)、FM-0711(捷恩智(JNC)公司製造)、FM-0711(捷恩智(JNC)公司製造)、FM-0721(捷恩智(JNC)公司製造)、FM-7711(捷恩智(JNC)公司製造)、FM-7725(捷恩智(JNC)公司製造)、TM-0701T(捷恩智(JNC)公司製造)等。Commercial products of carboxyl-containing silicone compounds include, for example, X-22-3701E (manufactured by Shin-Etsu Silicone Co., Ltd.), X-22-162C (manufactured by Shin-Etsu Silicone Co., Ltd.), or X -22-3710 (manufactured by Shin-Etsu Silicone) etc. Examples of commercially available products of acrylate group-containing silicone compounds include: X-22-164 (manufactured by Shin-Etsu Silicone Co., Ltd.) and X-22-174BX (manufactured by Shin-Etsu Silicone Co., Ltd.) , X-22-2426 (manufactured by Shin-Etsu silicone company), FM-0711 (manufactured by JNC), FM-0711 (manufactured by JNC), FM-0721 (manufactured by JNC), JNC), FM-7711 (manufactured by JNC), FM-7725 (manufactured by JNC), TM-0701T (manufactured by JNC), etc.

該些中,可較佳地選擇含能夠進行陽離子聚合的環氧基的矽氧烷化合物及/或含羥基的矽氧烷化合物。 矽氧烷化合物的重量平均分子量(Mw)較佳為200~50000,更佳為200~40000,進而佳為200~30000。藉由將分子量調整為該範圍,與光硬化性組成物中的其他成分的相容性提高。另外,於膜形成時,容易獲得十二分的表面偏向存在效果。 通式(1)中的n的較佳範圍為0~1,更佳為0.1~1,進而佳為0.3~1。可考慮R1 、L1 的種類或與構成光硬化性組成物的其他成分的親和性(相容性、硬化性、所製作的複製模的重覆適性等)來適宜選擇。Among these, a silicone compound containing an epoxy group capable of cation polymerization and/or a silicone compound containing a hydroxyl group can be preferably selected. The weight average molecular weight (Mw) of the siloxane compound is preferably 200 to 50,000, more preferably 200 to 40,000, and still more preferably 200 to 30,000. By adjusting the molecular weight to this range, compatibility with other components in the photocurable composition improves. In addition, at the time of film formation, it is easy to obtain a twelfth minute surface deflection existence effect. The preferable range of n in General formula (1) is 0-1, More preferably, it is 0.1-1, More preferably, it is 0.3-1. It can be appropriately selected in consideration of the types of R 1 and L 1 or the affinity with other components constituting the photocurable composition (compatibility, curability, reproducibility of the produced replica mold, etc.).

作為具有光反應性官能基的添加劑的另一例,可列舉含氟的環狀烯烴聚合物(具體而言為側鏈/末端具有光反應性官能基的含氟的環狀烯烴聚合物)。作為含氟的環狀烯烴聚合物,更具體而言,亦可列舉通式(2)所表示的特定的含氟的環狀烯烴聚合物。As another example of the additive having a photoreactive functional group, a fluorine-containing cyclic olefin polymer (specifically, a fluorine-containing cyclic olefin polymer having a photoreactive functional group at the side chain/terminal) can be cited. As a fluorine-containing cyclic olefin polymer, the specific fluorine-containing cyclic olefin polymer represented by general formula (2) can also be mentioned more specifically.

[化4]

Figure 02_image003
[化4]
Figure 02_image003

通式(2)中, L2 為選自由環氧基、胺基、乙烯基醚基、內酯基、丙烯基醚基、醇基、烯烴基、氧雜環丁基、乙烯基、丙烯酸酯基、甲醇基及羧基所組成的群組中的光反應性官能基, R2 ~R5 中的至少一個為選自由氟、含有氟的碳數1~10的烷基、含有氟的碳數1~10的烷氧基及含有氟的碳數2~10的烷氧基烷基所組成的群組中的含氟的基, 於R2 ~R5 並非含氟的基的情況下,R2 ~R5 為選自由氫、碳數1~10的烷基、碳數1~10的烷氧基及碳數2~10的烷氧基烷基所組成的群組中的有機基, R2 ~R5 可相同亦可不同,另外,R2 ~R5 可相互鍵結而形成環結構, 虛線表示該部分的鍵可為碳-碳單鍵亦可為碳-碳雙鍵。In the general formula (2), L 2 is selected from epoxy groups, amino groups, vinyl ether groups, lactone groups, propenyl ether groups, alcohol groups, alkene groups, oxetanyl groups, vinyl groups, and acrylate groups. At least one of R 2 to R 5 is selected from the group consisting of fluorine, fluorine-containing alkyl group having 1 to 10 carbon atoms, and fluorine-containing carbon number A fluorine-containing group in the group consisting of 1-10 alkoxy groups and fluorine-containing alkoxyalkyl groups having 2-10 carbon atoms. When R 2 to R 5 are not fluorine-containing groups, R 2 to R 5 are organic groups selected from the group consisting of hydrogen, alkyl groups having 1 to 10 carbons, alkoxy groups having 1 to 10 carbons, and alkoxyalkyl groups having 2 to 10 carbons, R 2 to R 5 may be the same or different. In addition, R 2 to R 5 may be bonded to each other to form a ring structure. The dotted line indicates that the bond in this part may be a carbon-carbon single bond or a carbon-carbon double bond.

於通式(2)中,於R2 ~R5 為含氟的基的情況下,具體而言,可列舉:氟;氟甲基、二氟甲基、三氟甲基、三氟乙基、五氟乙基、五氟丙基、六氟異丙基、七氟異丙基、六氟-2-甲基異丙基、全氟-2-甲基異丙基、正全氟丁基、正全氟戊基、全氟環戊基等烷基的氫的一部分或全部經氟取代的碳數1~10的烷基;氟甲氧基、二氟甲氧基、三氟甲氧基、三氟乙氧基、五氟乙氧基、七氟丙氧基、六氟異丙氧基、七氟異丙氧基、六氟-2-甲基異丙氧基、全氟-2-甲基異丙氧基、正全氟丁氧基、正全氟戊氧基、全氟環戊氧基等烷氧基的氫的一部分或全部經氟取代的碳數1~10的烷氧基;氟甲氧基甲基、二氟甲氧基甲基、三氟甲氧基甲基、三氟乙氧基甲基、五氟乙氧基甲基、七氟丙氧基甲基、六氟異丙氧基甲基、七氟異丙氧基甲基、六氟-2-甲基異丙氧基甲基、全氟-2-甲基異丙氧基甲基、正全氟丁氧基甲基、正全氟戊氧基甲基、全氟環戊氧基甲基等烷氧基烷基的氫的一部分或全部經氟取代的碳數2~10的烷氧基烷基等。In the general formula (2), when R 2 to R 5 are fluorine-containing groups, specific examples include fluorine; fluoromethyl, difluoromethyl, trifluoromethyl, and trifluoroethyl , Pentafluoroethyl, pentafluoropropyl, hexafluoroisopropyl, heptafluoroisopropyl, hexafluoro-2-methylisopropyl, perfluoro-2-methylisopropyl, n-perfluorobutyl , N-perfluoropentyl, perfluorocyclopentyl and other alkyl groups whose hydrogen part or all are substituted by fluorine; C1-10 alkyl groups; fluoromethoxy, difluoromethoxy, trifluoromethoxy , Trifluoroethoxy, pentafluoroethoxy, heptafluoropropoxy, hexafluoroisopropoxy, heptafluoroisopropoxy, hexafluoro-2-methylisopropoxy, perfluoro-2- Alkoxy groups with 1 to 10 carbon atoms in which part or all of the hydrogen of alkoxy groups such as methyl isopropoxy, n-perfluorobutoxy, n-perfluoropentoxy and perfluorocyclopentoxy are substituted with fluorine ; Fluoromethoxymethyl, difluoromethoxymethyl, trifluoromethoxymethyl, trifluoroethoxymethyl, pentafluoroethoxymethyl, heptafluoropropoxymethyl, hexafluoro Isopropoxymethyl, heptafluoroisopropoxymethyl, hexafluoro-2-methylisopropoxymethyl, perfluoro-2-methylisopropoxymethyl, n-perfluorobutoxy Alkoxyalkyl groups such as methyl group, n-perfluoropentyloxymethyl group, perfluorocyclopentyloxymethyl group, and the like are alkoxyalkyl groups having 2 to 10 carbon atoms in which part or all of hydrogen is substituted with fluorine.

R2 ~R5 可相互鍵結而形成環結構。例如,可形成全氟環烷基、介隔有氧的全氟環醚等環。R 2 to R 5 may be bonded to each other to form a ring structure. For example, it is possible to form a ring such as a perfluorocycloalkyl group and a perfluorocyclic ether interposed with oxygen.

於R2 ~R5 並非含氟的基的情況下,作為R2 ~R5 ,具體而言,可列舉:氫;甲基、乙基、丙基、異丙基、2-甲基異丙基、正丁基、正戊基、環戊基等碳數1~10的烷基;甲氧基、乙氧基、丙氧基、丁氧基、戊氧基等碳數1~10的烷氧基;甲氧基甲基、乙氧基甲基、丙氧基甲基、丁氧基甲基、戊氧基甲基等碳數2~10的烷氧基烷基等。When R 2 to R 5 are not fluorine-containing groups , specific examples of R 2 to R 5 include hydrogen; methyl, ethyl, propyl, isopropyl, 2-methylisopropyl Alkyl group, n-butyl, n-pentyl, cyclopentyl and other C1-C10 alkyl groups; methoxy, ethoxy, propoxy, butoxy, pentyloxy and other C1-C10 alkyl groups Oxy; methoxymethyl, ethoxymethyl, propoxymethyl, butoxymethyl, pentoxymethyl and other alkoxyalkyl groups having 2 to 10 carbon atoms.

作為通式(2)的R2 ~R5 ,較佳為氟;氟甲基、二氟甲基、三氟甲基、三氟乙基、五氟乙基、七氟丙基、六氟異丙基、七氟異丙基、六氟-2-甲基異丙基、全氟-2-甲基異丙基、正全氟丁基、正全氟戊基、全氟環戊基等烷基的氫的一部分或全部經氟取代的碳數1~10的氟烷基。 R 2 to R 5 in the general formula (2) are preferably fluorine; fluoromethyl, difluoromethyl, trifluoromethyl, trifluoroethyl, pentafluoroethyl, heptafluoropropyl, hexafluoroiso Propyl, heptafluoroisopropyl, hexafluoro-2-methylisopropyl, perfluoro-2-methylisopropyl, n-perfluorobutyl, n-perfluoropentyl, perfluorocyclopentyl and other alkanes A fluoroalkyl group having 1 to 10 carbon atoms in which part or all of the hydrogen of the group is substituted with fluorine.

作為通式(2)所表示的化合物,可進而佳地選擇L2 為能夠進行陽離子聚合的環氧基的、或含羥基的含氟的環狀烯烴聚合物。As the compound represented by the general formula (2), L 2 can be further preferably selected as an epoxy group capable of cationic polymerization or a hydroxyl group-containing fluorine-containing cyclic olefin polymer.

於具有光反應性官能基的添加劑為含氟的環狀烯烴聚合物的情況下,具有光反應性官能基的添加劑可僅包含一種通式(2)所表示的結構單元,亦可包含通式(2)的R2 ~R5 中的至少一個相互不同的兩種以上的結構單元。另外,亦可為包含通式(2)所表示的結構單元的一種或兩種以上、以及與通式(2)所表示的結構單元不同的結構單元的聚合物(共聚物)。 含氟的環狀烯烴聚合物可適宜應用公知技術而獲得。例如,可適宜應用與環狀烯烴的開環聚合相關的公知技術而獲得。聚合條件或使用觸媒等的具體例於後述的實施例中有記載。When the additive having a photoreactive functional group is a fluorine-containing cyclic olefin polymer, the additive having a photoreactive functional group may include only one structural unit represented by the general formula (2), or may include the general formula (2) Two or more structural units different from each other in at least one of R 2 to R 5. In addition, it may be a polymer (copolymer) containing one or two or more of the structural units represented by the general formula (2) and a structural unit different from the structural unit represented by the general formula (2). The fluorine-containing cyclic olefin polymer can be obtained by appropriately applying known techniques. For example, it can be obtained by suitably applying a known technique related to ring-opening polymerization of cyclic olefins. Specific examples of polymerization conditions and catalysts used are described in Examples described later.

含氟的環狀烯烴聚合物中的主鏈的烯烴可較佳地選擇藉由氫化而形成飽和脂肪族結構的通式(2)所表示的含氟的環狀烯烴聚合物。主鏈烯烴的氫化率較佳為50%~100%,更佳為70%~100%,進而佳為90%~100%。 藉由主鏈烯烴的氫化率為所述範圍,於光硬化時,可抑制由碳-碳雙鍵引起的光吸收,光容易到達至樹脂膜的深部。即,光硬化的效率性提高。 氫化反應可利用公知的方法來實施。可為使用固體觸媒的方法,亦可為使用均相觸媒的方法,可將該些觸媒的兩種以上混合使用。較佳為可適宜地選擇使用固體觸媒的方法,所述方法於反應後的後處理中可藉由過濾而容易地去除觸媒。The olefin of the main chain in the fluorine-containing cyclic olefin polymer can preferably be selected from the fluorine-containing cyclic olefin polymer represented by the general formula (2) which forms a saturated aliphatic structure by hydrogenation. The hydrogenation rate of the main chain olefin is preferably 50% to 100%, more preferably 70% to 100%, and still more preferably 90% to 100%. When the hydrogenation rate of the main chain olefin is in the above-mentioned range, the light absorption due to the carbon-carbon double bond can be suppressed during photocuring, and the light can easily reach the deep part of the resin film. That is, the efficiency of photocuring is improved. The hydrogenation reaction can be carried out by a known method. It may be a method using a solid catalyst or a method using a homogeneous catalyst, and two or more of these catalysts may be mixed and used. Preferably, a method of using a solid catalyst can be appropriately selected, and the method can easily remove the catalyst by filtration in the post-treatment after the reaction.

含氟的環狀烯烴聚合物的重量平均分子量(Mw)較佳為500~50000,更佳為500~40000,進而佳為500~30000。藉由將Mw調整為該範圍,與其他成分的相容性提高,容易製備成均勻的溶液。另外,於製成膜時,容易有效地偏析於表面。The weight average molecular weight (Mw) of the fluorine-containing cyclic olefin polymer is preferably 500 to 50,000, more preferably 500 to 40,000, and still more preferably 500 to 30,000. By adjusting Mw to this range, compatibility with other components is improved, and it is easy to prepare a uniform solution. In addition, when forming a film, it is easy to effectively segregate on the surface.

(光硬化起始劑) 本實施形態的光硬化性組成物較佳為包含光硬化起始劑。 作為光硬化起始劑,可列舉藉由光的照射而生成自由基的光自由基起始劑、藉由光的照射而生成陽離子的光陽離子起始劑等。(Light hardening initiator) The photocurable composition of this embodiment preferably contains a photocuring initiator. As the photohardening initiator, a photo-radical initiator that generates radicals by light irradiation, a photocationic initiator that generates cations by light irradiation, and the like can be cited.

光硬化起始劑中,作為藉由光的照射而生成自由基的光自由基起始劑,例如可列舉:苯乙酮、對第三丁基三氯苯乙酮、氯苯乙酮、2,2-二乙氧基苯乙酮、羥基苯乙酮、2,2-二甲氧基-2'-苯基苯乙酮、2-胺基苯乙酮、二烷基胺基苯乙酮等苯乙酮類;安息香、安息香甲醚、安息香乙醚、安息香異丙醚、安息香異丁醚、1-羥基環己基苯基酮、2-羥基-2-甲基-1-苯基-2-甲基丙烷-1-酮、1-(4-異丙基苯基)-2-羥基-2-甲基丙烷-1-酮等安息香類;二苯甲酮、苯甲醯苯甲酸、苯甲醯苯甲酸甲酯、甲基鄰苯甲醯基苯甲酸酯、4-苯基二苯甲酮、羥基二苯甲酮、羥基丙基二苯甲酮、丙烯酸基二苯甲酮、4,4'-雙(二甲基胺基)二苯甲酮等二苯甲酮類;硫雜蒽酮、2-氯硫雜蒽酮、2-甲基硫雜蒽酮、二乙基硫雜蒽酮、二甲基硫雜蒽酮等硫雜蒽酮類;全氟(第三丁基過氧化物)、全氟苯甲醯基過氧化物等氟系過氧化物類;α-醯基肟基酯、苄基-(鄰乙氧基羰基)-α-單肟、醯基氧化膦、乙醛酸酯、3-酮香豆素、2-乙基蒽醌、樟腦醌、硫化四甲基秋蘭姆、偶氮雙異丁腈、過氧化苯甲醯、二烷基過氧化物、過氧化特戊酸第三丁酯等。該些多數情況下主要於光的波長為200 nm~400 nm的UV區域中顯現出其功能。Among the photohardening initiators, as photoradical initiators that generate radicals by light irradiation, for example, acetophenone, p-tert-butyl trichloroacetophenone, chloroacetophenone, and 2 ,2-diethoxyacetophenone, hydroxyacetophenone, 2,2-dimethoxy-2'-phenylacetophenone, 2-aminoacetophenone, dialkylaminoacetophenone Acetophenones; benzoin, benzoin methyl ether, benzoin ethyl ether, benzoin isopropyl ether, benzoin isobutyl ether, 1-hydroxycyclohexyl phenyl ketone, 2-hydroxy-2-methyl-1-phenyl-2- Benzoins such as methylpropane-1-one, 1-(4-isopropylphenyl)-2-hydroxy-2-methylpropane-1-one; benzophenone, benzoic acid, benzyl Methyl benzoate, methyl phthalate, 4-phenylbenzophenone, hydroxybenzophenone, hydroxypropyl benzophenone, acrylic benzophenone, 4, Benzophenones such as 4'-bis(dimethylamino)benzophenone; thioxanthone, 2-chlorothioxanthone, 2-methylthioxanthone, diethylthioxanthone Thioxanthones such as ketones and dimethyl thioxanthone; perfluoro (tertiary butyl peroxide), perfluorobenzyl peroxide and other fluorine-based peroxides; α-acetoxime Base ester, benzyl-(o-ethoxycarbonyl)-α-monooxime, phosphine oxide, glyoxylate, 3-ketocoumarin, 2-ethylanthraquinone, camphorquinone, tetramethylsulfide Thiuram, azobisisobutyronitrile, benzyl peroxide, dialkyl peroxide, t-butyl peroxypivalate, etc. In most cases, these functions are mainly manifested in the UV region where the wavelength of light is 200 nm to 400 nm.

作為可較佳地使用的光自由基起始劑,可列舉:豔佳固(Irgacure)651(汽巴精化(Ciba Specialty Chemicals)公司製造)、豔佳固(Irgacure)184(汽巴精化(Ciba Specialty Chemicals)公司製造)、達羅固(Darocur)1173(汽巴精化(Ciba Specialty Chemicals)公司製造)、二苯甲酮、4-苯基二苯甲酮、豔佳固(Irgacure)500(汽巴精化(Ciba Specialty Chemicals)公司製造)、豔佳固(Irgacure)2959(汽巴精化(Ciba Specialty Chemicals)公司製造)、豔佳固(Irgacure)127(汽巴精化(Ciba Specialty Chemicals)公司製造)、豔佳固(Irgacure)907(汽巴精化(Ciba Specialty Chemicals)公司製造)、豔佳固(Irgacure)369(汽巴精化(Ciba Specialty Chemicals)公司製造)、豔佳固(Irgacure)1300(汽巴精化(Ciba Specialty Chemicals)公司製造)、豔佳固(Irgacure)819(汽巴精化(Ciba Specialty Chemicals)公司製造)、豔佳固(Irgacure)1800(汽巴精化(Ciba Specialty Chemicals)公司製造)、達羅固(Darocur)TPO(汽巴精化(Ciba Specialty Chemicals)公司製造)、達羅固(Darocur)4265(汽巴精化(Ciba Specialty Chemicals)公司製造)、豔佳固(Irgacure)OXE01(汽巴精化(Ciba Specialty Chemicals)公司製造)、豔佳固(Irgacure)OXE02(汽巴精化(Ciba Specialty Chemicals)公司製造)、艾薩固(Esacure)KT55(寧柏迪(Lamberti)公司製造)、艾薩固(Esacure)KIP150(寧柏迪(Lamberti)公司製造)、艾薩固(Esacure)KIP100F(寧柏迪(Lamberti)公司製造)、艾薩固(Esacure)KT37(寧柏迪(Lamberti)公司製造)、艾薩固(Esacure)KTO46(寧柏迪(Lamberti)公司製造)、艾薩固(Esacure)1001M(寧柏迪(Lamberti)公司製造)、艾薩固(Esacure)KIP/EM(寧柏迪(Lamberti)公司製造)、艾薩固(Esacure)DP250(寧柏迪(Lamberti)公司製造)、艾薩固(Esacure)KB1(寧柏迪(Lamberti)公司製造)、2,4-二乙基硫雜蒽酮等。 該些中,作為可進而佳地使用的光自由基聚合起始劑,可列舉:豔佳固(Irgacure)184(汽巴精化(Ciba Specialty Chemicals)公司製造)、達羅固(Darocur)1173(汽巴精化(Ciba Specialty Chemicals)公司製造)、豔佳固(Irgacure)500(汽巴精化(Ciba Specialty Chemicals)公司製造)、豔佳固(Irgacure)819(汽巴精化(Ciba Specialty Chemicals)公司製造)、達羅固(Darocur)TPO(汽巴精化(Ciba Specialty Chemicals)公司製造)、艾薩固(Esacure)KIP100F(寧柏迪(Lamberti)公司製造)、艾薩固(Esacure)KT37(寧柏迪(Lamberti)公司製造)及艾薩固(Esacure)KTO46(寧柏迪(Lamberti)公司製造)等。As the photo-radical initiator that can be used preferably, there can be cited: Irgacure 651 (manufactured by Ciba Specialty Chemicals), Irgacure 184 (Ciba Specialty Chemicals) (Manufactured by Ciba Specialty Chemicals), Darocur 1173 (manufactured by Ciba Specialty Chemicals), benzophenone, 4-phenylbenzophenone, Irgacure 500 (manufactured by Ciba Specialty Chemicals), Irgacure 2959 (manufactured by Ciba Specialty Chemicals), Irgacure 127 (manufactured by Ciba Specialty Chemicals) Specialty Chemicals), Irgacure 907 (manufactured by Ciba Specialty Chemicals), Irgacure 369 (manufactured by Ciba Specialty Chemicals), Yan Irgacure 1300 (manufactured by Ciba Specialty Chemicals), Irgacure 819 (manufactured by Ciba Specialty Chemicals), Irgacure 1800 (manufactured by Ciba Specialty Chemicals) (Manufactured by Ciba Specialty Chemicals), Darocur TPO (manufactured by Ciba Specialty Chemicals), Darocur 4265 (Ciba Specialty Chemicals) Company), Irgacure OXE01 (manufactured by Ciba Specialty Chemicals), Irgacure OXE02 (manufactured by Ciba Specialty Chemicals), Isagu (manufactured by Ciba Specialty Chemicals), Irgacure OXE01 (manufactured by Ciba Specialty Chemicals), Irgacure OXE02 (manufactured by Ciba Specialty Chemicals), Esacure KT55 (manufactured by Lamberti), Esacure KIP150 (manufactured by Lamberti), Esacure KIP100F (manufactured by Lamberti), Esacure KT37 (manufactured by Lamberti), Esacure KTO 46 (manufactured by Lamberti), Esacure 1001M (manufactured by Lamberti), Esacure KIP/EM (manufactured by Lamberti), Esacure DP250 (manufactured by Lamberti), Esacure KB1 (manufactured by Lamberti), 2,4-diethyl thioxanthone, etc. Among these, as photo radical polymerization initiators that can be further preferably used, Irgacure 184 (manufactured by Ciba Specialty Chemicals), Darocur 1173 (Manufactured by Ciba Specialty Chemicals), Irgacure 500 (manufactured by Ciba Specialty Chemicals), Irgacure 819 (manufactured by Ciba Specialty Chemicals) Chemicals), Darocur TPO (manufactured by Ciba Specialty Chemicals), Esacure KIP100F (manufactured by Lamberti), Esacure ) KT37 (manufactured by Lamberti) and Esacure KTO46 (manufactured by Lamberti), etc.

光硬化起始劑中,作為藉由光的照射而生成陽離子的光陽離子起始劑,只要是藉由光照射而使所述能夠進行陽離子聚合的開環聚合性化合物的陽離子聚合起始的化合物,則並無特別限定。較佳為鎓陽離子-其抗衡陰離子的鎓鹽之類的進行光反應而釋放路易斯酸的化合物。該些多數情況下主要於光的波長為200 nm~400 nm的UV區域中顯現出其功能。Among the photocuring initiators, as a photocationic initiator that generates cations by light irradiation, any compound that initiates cationic polymerization of the ring-opening polymerizable compound capable of undergoing cation polymerization by light irradiation , There is no particular limitation. It is preferably an onium cation-an onium salt of its counter anion, which undergoes a photoreaction to release a Lewis acid. In most cases, these functions are mainly manifested in the UV region where the wavelength of light is 200 nm to 400 nm.

作為鎓陽離子,例如可列舉:二苯基錪、4-甲氧基二苯基錪、雙(4-甲基苯基)錪、雙(4-第三丁基苯基)錪、雙(十二烷基苯基)錪、三苯基鋶、二苯基-4-硫苯氧基苯基鋶、雙[4-(二苯基鋶基)-苯基]硫醚、雙[4-(二(4-(2-羥基乙基)苯基)鋶基)-苯基]硫醚、η5-2,4-(環戊二烯基)[1,2,3,4,5,6-η-(甲基乙基)苯]-鐵(1+)等。另外,除鎓陽離子以外,亦可列舉:過氯酸根離子、三氟甲磺酸根離子、甲苯磺酸根離子、三硝基甲苯磺酸根離子等。 另一方面,作為抗衡陰離子,例如可列舉:四氟硼酸鹽、六氟磷酸鹽、六氟銻酸鹽、六氟砷酸鹽、六氯銻酸鹽、四(氟苯基)硼酸鹽、四(二氟苯基)硼酸鹽、四(三氟苯基)硼酸鹽、四(四氟苯基)硼酸鹽、四(五氟苯基)硼酸鹽、四(全氟苯基)硼酸鹽、四(三氟甲基苯基)硼酸鹽、四(二(三氟甲基)苯基)硼酸鹽等。Examples of onium cations include diphenyl iodonium, 4-methoxydiphenyl iodonium, bis(4-methylphenyl) iodonium, bis(4-tertiary butylphenyl) iodonium, bis(ten Dialkylphenyl) iodonium, triphenyl sulfonium, diphenyl-4-thiophenoxy phenyl sulfide, bis[4-(diphenylsulfonyl)-phenyl]sulfide, bis[4-( Bis(4-(2-hydroxyethyl)phenyl)ethanyl)-phenyl)sulfide, η5-2,4-(cyclopentadienyl)[1,2,3,4,5,6- η-(methylethyl)benzene]-iron (1+) and so on. In addition, in addition to onium cations, perchlorate ions, trifluoromethanesulfonate ions, tosylate ions, trinitrotoluenesulfonate ions, and the like can also be cited. On the other hand, as a counter anion, for example, tetrafluoroborate, hexafluorophosphate, hexafluoroantimonate, hexafluoroarsenate, hexachloroantimonate, tetrakis(fluorophenyl)borate, tetrakis (Difluorophenyl) borate, tetrakis (trifluorophenyl) borate, tetrakis (tetrafluorophenyl) borate, tetrakis (pentafluorophenyl) borate, tetrakis (perfluorophenyl) borate, tetrakis (Trifluoromethylphenyl)borate, tetrakis(bis(trifluoromethyl)phenyl)borate, etc.

作為可進而佳地使用的光陽離子起始劑的具體例,例如可列舉:豔佳固(Irgacure)250(汽巴精化(Ciba Specialty Chemicals)公司製造)、豔佳固(Irgacure)784(汽巴精化(Ciba Specialty Chemicals)公司製造)、豔佳固(Irgacure)290(日本巴斯夫(BASF)公司製造)、艾薩固(Esacure)1064(寧柏迪(Lamberti)公司製造)、薩拉魯(CYRAURE)UVI6990(日本聯合碳化物公司(Union Carbide Corporation)製造)、艾迪科奧普托(ADEKA Optoma)SP-172(艾迪科(ADEKA)公司製造)、艾迪科奧普托(ADEKA Optoma)SP-170(旭電化公司製造)、艾迪科奧普托(ADEKA Optoma)SP-152(艾迪科(ADEKA)公司製造)、艾迪科奧普托(ADEKA Optoma)SP-150(艾迪科(ADEKA)公司製造)、CPI-400(三亞普羅(San-Apro)公司製造)、CPI-310B(三亞普羅(San-Apro)公司製造)、CPI-210K(三亞普羅(San-Apro)公司製造)、CPI-210S(三亞普羅(San-Apro)公司製造)、CPI-100P(三亞普羅(San-Apro)公司製造)等。As specific examples of photocationic initiators that can be further preferably used, for example, Irgacure 250 (manufactured by Ciba Specialty Chemicals), Irgacure 784 (vapor (Manufactured by Ciba Specialty Chemicals), Irgacure 290 (manufactured by BASF in Japan), Esacure 1064 (manufactured by Lamberti), Saralu (CYRAURE) UVI6990 (manufactured by Union Carbide Corporation), ADEKA Optoma SP-172 (manufactured by ADEKA), ADEKA Optoma SP-170 (made by Asahi Denka), ADEKA Optoma SP-152 (made by ADEKA), ADEKA Optoma SP-150 ( ADEKA (manufactured by ADEKA), CPI-400 (manufactured by San-Apro), CPI-310B (manufactured by San-Apro), CPI-210K (Sanya Pro (San-Apro) ), CPI-210S (manufactured by San-Apro), CPI-100P (manufactured by San-Apro), etc.

於本實施形態的光硬化性組成物包含光硬化起始劑的情況下,可僅包含一種光硬化起始劑,亦可包含兩種以上。 於以光硬化性組成物的整體為基準(100質量%)時,光硬化性組成物中的光硬化起始劑的含量較佳為0.1質量%~20質量%,更佳為1.0質量%~15質量%。When the photocurable composition of the present embodiment includes a photocuring initiator, it may include only one type of photocuring initiator, or two or more types. On the basis of the entire photocurable composition (100% by mass), the content of the photocuring initiator in the photocurable composition is preferably 0.1% by mass to 20% by mass, more preferably 1.0% by mass to 15% by mass.

(增感劑) 本實施形態的光硬化性組成物亦可包含增感劑。 作為增感劑,可列舉:蒽、萘、酚噻嗪(phenothiazene)、苝、硫雜蒽酮、二苯甲酮硫雜蒽酮等。進而,作為增感色素,可例示硫代吡喃鎓(thiopyrylium)鹽系色素、部花青系色素、喹啉系色素、苯乙烯基喹啉系色素、酮香豆素系色素、硫雜蒽系色素、氧雜蒽系色素、氧雜菁系色素、花青系色素、若丹明系色素、吡喃鎓鹽系色素等。較佳為蒽系或萘系的增感劑,藉由與陽離子系硬化起始劑(陽離子系聚合起始劑)併用,感度飛躍性提高。作為具體的蒽系或萘系的化合物,可例示:二丁氧基蒽、二乙氧基蒽、二丙氧基蒽醌、雙(辛醯基氧基)蒽、二乙氧基萘等。 於使用增感劑時,於以本實施形態的光硬化性組成物的整體為基準(100%)時,所述增感劑的添加量較佳為0.01質量%~20質量%,更佳為0.01質量%~10質量%,進而佳為0.01質量%~10質量%,亦可組合使用多種增感劑。(Sensitizer) The photocurable composition of this embodiment may contain a sensitizer. Examples of sensitizers include anthracene, naphthalene, phenothiazene, perylene, thioxanthone, and benzophenone thioxanthone. Furthermore, as sensitizing dyes, thiopyrylium (thiopyrylium) salt dyes, merocyanine dyes, quinoline dyes, styrylquinoline dyes, ketocoumarin dyes, and thioxanthene can be exemplified. Dye, xanthene dye, xanthene dye, cyanine dye, rhodamine dye, pyrylium salt dye, etc. An anthracene-based or naphthalene-based sensitizer is preferred, and by using it in combination with a cationic curing initiator (a cationic polymerization initiator), the sensitivity is dramatically improved. Specific examples of anthracene-based or naphthalene-based compounds include dibutoxyanthracene, diethoxyanthracene, dipropoxyanthraquinone, bis(octyloxy)anthracene, diethoxynaphthalene, and the like. When a sensitizer is used, the amount of the sensitizer added is preferably 0.01% by mass to 20% by mass, and more preferably, based on the entire photocurable composition of this embodiment (100%) 0.01% by mass to 10% by mass, more preferably 0.01% by mass to 10% by mass, and multiple sensitizers may be used in combination.

(其他成分) 本實施形態的光硬化性組成物亦可包含所述以外的成分。 例如,可包含溶劑、抗老化劑、調平劑、潤濕性改良劑、界面活性劑、塑化劑等改質劑、紫外線吸收劑、防腐劑、抗菌劑等穩定劑、光增感劑、矽烷偶合劑等。例如,塑化劑除所述目標效果外,有時亦有助於黏性的調整,因此較佳。(Other ingredients) The photocurable composition of this embodiment may contain components other than the above. For example, it may contain solvents, anti-aging agents, leveling agents, wettability modifiers, surfactants, plasticizers and other modifiers, ultraviolet absorbers, preservatives, antibacterial agents and other stabilizers, photosensitizers, Silane coupling agent, etc. For example, in addition to the above-mentioned target effect, the plasticizer sometimes also contributes to the adjustment of viscosity, so it is preferable.

(光硬化性組成物的光照射硬化後的物性) 於奈米壓印製程中,例如進行如下製程:使被加工基板的加工中所使用的第二光硬化性組成物與包含光硬化性組成物(第一光硬化性組成物)的複製模的凹凸面接觸,一邊施加壓力,一邊進行UV照射,使第二光硬化性組成物硬化並加以剝離,從而於被加工基板表面形成凹凸結構。於該製程中,先前,特別是於重覆使用複製模時,會產生樹脂附著於複製模表面或因外部應力而破壞凹凸結構的形狀等妨礙複製模的重覆使用的不良情況。 本發明者等人對該些不良情況與硬化後的樹脂物性的關係進行了努力研究。結果發現,於使用所述光硬化性組成物且光硬化後的樹脂表面的表面自由能與樹脂硬度處於後述的範圍的情況下,即使重覆使用複製模,複製模亦容易保持初始狀態,可實現被加工基板的良好加工。 以下,對表面自由能與樹脂硬度進行具體說明。(Physical properties of photocurable composition after curing by light irradiation) In the nanoimprinting process, for example, the following process is performed: the second photocurable composition used in the processing of the substrate to be processed and the copy mold containing the photocurable composition (first photocurable composition) The concave-convex surface is in contact, and UV irradiation is performed while applying pressure to harden and peel the second photocurable composition, thereby forming a concave-convex structure on the surface of the substrate to be processed. In this process, previously, especially when the replica mold is repeatedly used, the resin adheres to the surface of the replica mold or the shape of the uneven structure is damaged due to external stress, which prevents the repeated use of the replica mold. The inventors of the present invention conducted diligent studies on the relationship between these problems and the physical properties of the resin after curing. As a result, it was found that when the photocurable composition is used and the surface free energy of the resin surface after photocuring and the resin hardness are in the range described below, even if the replica mold is used repeatedly, the replica mold can easily maintain the original state. Achieve good processing of the processed substrate. Hereinafter, the surface free energy and resin hardness will be specifically described.

i)關於表面自由能 於為使用複製模的奈米壓印法時,認為對於複製模表面的樹脂附著是藉由將複製模的表面能設計得適度低來實現的。 通常,作為得知表面能等表面狀態的方法,通常是使用水滴的接觸角法。具有代表性的是,經氟樹脂處理的基材表面會排斥水滴,並且基材表面與水滴的角度(接觸角)超過100°。 另一方面,於包含經羥基之類的容易親和水的基修飾的材料的基材表面中,水的接觸角小至數°~數十°。然而,於藉由水的接觸角來評價基材表面狀態的方法中,即使可進行得知因氫鍵力引起的分子間力的定性評價,亦無法進行於兩種物質間(複製模與第二光硬化性組成物之間)發揮作用的各種力,具體而言為氫鍵力、分散力、配向力、誘導力等的評價。i) Regarding surface free energy In the case of the nanoimprint method using the replica mold, it is believed that the adhesion of the resin to the surface of the replica mold is achieved by designing the surface energy of the replica mold to be moderately low. Generally, as a method of knowing the surface state such as surface energy, the contact angle method of water droplets is usually used. Typically, the surface of the substrate treated with fluororesin repels water droplets, and the angle (contact angle) between the surface of the substrate and the water droplet exceeds 100°. On the other hand, on the surface of a substrate containing a material modified with a group that is easily compatible with water such as a hydroxyl group, the contact angle of water is as small as several degrees to several tens of degrees. However, in the method of evaluating the surface state of the substrate by the contact angle of water, even if the qualitative evaluation of the intermolecular force caused by the hydrogen bonding force can be carried out, it cannot be carried out between the two substances (the replica and the first (2) The various forces that act between the photocurable composition, specifically the evaluation of the hydrogen bonding force, the dispersion force, the alignment force, and the inductive force.

本發明者等人發現,即使是水的接觸角為相同程度的材料,亦存在製成複製模時的樹脂附著性不同的情況。基於該發現,進一步進行研究,結果,本發明者等人認為水的接觸角只不過是表示與水的關係性的索引,通常難以判斷作為有機化合物的複製模與第二光硬化性組成物的親和性。而且,關於其他評價法,發現光硬化後的樹脂膜表面的自由能(以下,亦簡稱為表面自由能)與複製模使用時的樹脂附著的程度恰到好處地相關。 更具體而言,若以於光硬化後的樹脂膜(複製模)表面發揮作用的氫鍵力、分散力、配向力、誘導力的總和的形式表示的表面自由能小於特定的值,則於在複製模的表面塗佈第二光硬化性組成物,進行光硬化並加以剝離時,第二光硬化性組成物的殘渣不易殘留於複製模表面的微細凹凸結構中。另一方面,若表面自由能超過特定的值,則第二光硬化性組成物的殘渣容易附著,複製模容易劣化而無法重覆使用。所謂此處的「附著」是指於顯著的情況下,藉由目視亦可確認使用後的複製模的表面的變質(更詳細而言,藉由利用光學顯微鏡或掃描型電子顯微鏡(Scanning Electron Microscope,SEM)等的觀察,可得知第二光硬化性組成物的附著程度)。The inventors of the present invention have discovered that even when the contact angle of water is the same, the adhesion of the resin when used as a replica mold may be different. Based on this finding, further studies were carried out. As a result, the inventors believed that the contact angle of water is merely an index indicating the relationship with water, and it is generally difficult to judge whether it is a replica of an organic compound and a second photocurable composition. Affinity. Furthermore, with regard to other evaluation methods, it was found that the free energy of the resin film surface after photocuring (hereinafter also simply referred to as surface free energy) and the degree of adhesion of the resin during use of the replica mold are properly correlated. More specifically, if the surface free energy expressed in the form of the sum of the hydrogen bonding force, the dispersion force, the alignment force, and the inductive force acting on the surface of the resin film (replication mold) after photocuring is less than a specific value, then When the second photocurable composition is coated on the surface of the replica mold, photocured and peeled off, the residue of the second photocurable composition is unlikely to remain in the fine uneven structure on the surface of the replica mold. On the other hand, if the surface free energy exceeds a specific value, the residue of the second photocurable composition is likely to adhere, and the replica mold is likely to deteriorate and cannot be used repeatedly. The so-called "adhesion" here means that when it is remarkable, the deterioration of the surface of the replica mold after use can also be confirmed by visual inspection (more specifically, by using an optical microscope or a scanning electron microscope (Scanning Electron Microscope) , SEM) and other observations, the degree of adhesion of the second photocurable composition can be known).

定量而言,如以下的評價方法1般進行而測定的光硬化後的樹脂膜的表面自由能較佳為15 mJ/m2 ~40 mJ/m2 ,更佳為15 mJ/m2 ~38 mJ/m2 ,進而佳為15 mJ/m2 ~35 mJ/m2 。 於表面自由能大於40 mJ/m2 的情況下,如上所述,光照射硬化後的第二光硬化性組成物會附著於複製模。另外,於表面自由能小於15 mJ/m2 的情況下,塗佈時的與複製模的親和差,於複製模的表面第二光硬化性組成物容易被排斥。而且,若於該狀態下進行壓接、光照射並加以剝離,則存在產生例如源自無處可逃的氣泡的空隙(void)等的情況。Quantitatively, the surface free energy of the resin film after photocuring measured as in Evaluation Method 1 below is preferably 15 mJ/m 2 to 40 mJ/m 2 , and more preferably 15 mJ/m 2 to 38 mJ/m 2 , more preferably 15 mJ/m 2 to 35 mJ/m 2 . In the case where the surface free energy is greater than 40 mJ/m 2 , as described above, the second photocurable composition cured by light irradiation adheres to the replica mold. In addition, when the surface free energy is less than 15 mJ/m 2 , the affinity with the replica mold during coating is poor, and the second photocurable composition is easily repelled from the surface of the replica mold. Furthermore, if crimping, light irradiation, and peeling are performed in this state, for example, voids originating from air bubbles that have nowhere to escape may be generated.

[評價方法1] 首先,將光硬化性組成物塗佈於基板而形成光硬化性膜,照射紫外線而獲得經硬化的硬化膜。 其次,使用接觸角計分別測定水、二碘甲烷及1-溴萘相對於所述硬化膜的接觸角。 然後,根據Kitazaki-Hata的理論來算出表面自由能。[Evaluation Method 1] First, a photocurable composition is applied to a substrate to form a photocurable film, and ultraviolet rays are irradiated to obtain a cured cured film. Next, a contact angle meter was used to measure the contact angles of water, diiodomethane, and 1-bromonaphthalene with respect to the cured film. Then, calculate the surface free energy according to Kitazaki-Hata's theory.

順便一說,為了使光硬化性膜充分(實質上完全)硬化,照射充分光量的光、例如2000 mJ/cm2 的累計光量的紫外線。照射可利用波長365 nm的UV光(發光二極體(Light Emitting Diode,LED)光源)等來進行。另外,評價方法1中的光硬化性膜的厚度例如為5 μm~6 μm(5.5 μm±0.5 μm)左右。Incidentally, in order to fully (substantially complete) curing the photocurable film, a sufficient amount of light, for example, ultraviolet rays with a cumulative light amount of 2000 mJ/cm 2 is irradiated. Irradiation can be performed with UV light (Light Emitting Diode (LED) light source) with a wavelength of 365 nm. In addition, the thickness of the photocurable film in the evaluation method 1 is, for example, about 5 μm to 6 μm (5.5 μm±0.5 μm).

基於Kitazaki-Hata的理論的表面自由能的算出可藉由市售的接觸角計所附帶的軟體等來進行。為了以防萬一,以下,預先對Kitazaki-Hata的理論進行說明。 當將測定對象的硬化膜的表面自由能設為A,將表面自由能A的成分設為歸屬於分散力的成分(Ad )、歸屬於配向(極性)力的成分(Ap )及歸屬於氫鍵力的成分(Ah )時,A表示為式(1)(由於所述說明中的誘導力所引起的分子間力極小,因此於計算上忽視)。The calculation of the surface free energy based on Kitazaki-Hata's theory can be performed by software attached to a commercially available contact angle meter. Just in case, the following explains Kitazaki-Hata's theory in advance. When the surface free energy of the cured film of the measurement object is set to A, the component of the surface free energy A is set to the component attributable to the dispersive force (A d ), the component attributable to the alignment (polar) force (A p ), and the attribution Regarding the component (A h ) of the hydrogen bonding force, A is expressed as formula (1) (the intermolecular force caused by the inductive force in the description is extremely small, so it is ignored in the calculation).

[數式1] A=Ad +Ap +Ah 式(1)[Numerical formula 1] A=A d +A p +A h formula (1)

另外,當將各成分的值已知的液體1的表面自由能設為B1 ,將表面自由能B1 的成分設為歸屬於分散力的成分(B1d )、歸屬於配向(極性)力的成分(B1p )及歸屬於氫鍵力的成分(B1h )時,B1 表示為式(2)。In addition, when the surface free energy of the liquid 1 whose value of each component is known is set to B 1 , the component of the surface free energy B 1 is set to the component (B 1d ) attributed to the dispersing force, which is attributed to the alignment (polar) force In the case of the component (B 1p ) and the component (B 1h ) attributed to the hydrogen bonding force, B 1 is represented by formula (2).

[數式2] B1 =B1d +B1p +B1h 式(2)[Numerical formula 2] B 1 =B 1d +B 1p +B 1h formula (2)

同樣地,當將各成分的值已知的液體2的表面自由能設為B2 ,將各成分的值已知的液體3的表面自由能設為B3 時,B2 及B3 分別表示為式(3)及式(4)。Similarly, when the surface free energy of the liquid 2 whose value of each component is known is set to B 2 , and the surface free energy of the liquid 3 whose value of each component is known is set to B 3 , B 2 and B 3 respectively denote For formula (3) and formula (4).

[數式3] B2 =B2d +B2p +B2h 式(3) B3 =B3d +B3p +B3h 式(4)[Numerical formula 3] B 2 =B 2d +B 2p +B 2h formula (3) B 3 =B 3d +B 3p +B 3h formula (4)

進而,當將使用測定對象的硬化膜與液體1所測定的接觸角設為θ1 ,將測定對象的硬化膜與液體2的接觸角設為θ2 ,將測定對象的硬化膜與液體3的接觸角設為θ3 時,於測定對象的硬化膜與液體1、液體2及液體3的表面自由能的各成分和接觸角的值中,式(5)、式(6)及式(7)的關係成立。Furthermore, when the contact angle measured using the cured film of the measurement object and the liquid 1 is set to θ 1 , the contact angle between the cured film of the measurement target and the liquid 2 is set to θ 2 , and the contact angle between the cured film of the measurement target and the liquid 3 When the contact angle is set to θ 3 , in the values of the contact angles and the respective components of the surface free energy of the cured film of the measuring object and Liquid 1, Liquid 2, and Liquid 3, equations (5), (6), and (7) ) Relationship is established.

[數式4]

Figure 02_image007
式(5)
Figure 02_image009
式(6)
Figure 02_image011
式(7)[Equation 4]
Figure 02_image007
Formula (5)
Figure 02_image009
Formula (6)
Figure 02_image011
Formula (7)

藉由解包含所述式(5)、式(6)及式(7)的聯立三元一次方程式,分別算出Ad 、Ap 及Ah 。然後,根據式(1)來算出硬化膜的表面自由能A。With solutions containing the formula (5), ternary simultaneous equations of formula (6) and (7) respectively calculates A d, A p and A h. Then, the surface free energy A of the cured film is calculated according to equation (1).

ii)關於樹脂硬度 作為重覆使用複製模時的不良模式,除所述樹脂附著以外,亦可列舉於壓接製程等中所產生的複製模表面的凹凸結構的崩塌。例如,於線與空間形狀的情況下,表示線斷裂或線邊緣的缺口。另外,於為柱形狀時,表示柱折斷等不良情況。 通常,樹脂硬度由劃痕試驗的損傷的程度或鉛筆硬度表示,所述鉛筆硬度由利用所指定的鉛筆擦傷時的鉛筆的硬度表示。但是,即使該些方法可適應於例如平坦面的整體(bulk)評價,亦無法適應於判斷微細凹凸結構的形狀保持的評價。ii) About resin hardness As a failure mode when the replica mold is repeatedly used, in addition to the resin adhesion, collapse of the uneven structure on the surface of the replica mold generated in a pressure bonding process or the like can also be cited. For example, in the case of a line and space shape, it means a line break or a gap at the edge of the line. In addition, in the case of a column shape, it indicates defects such as column breakage. Generally, the resin hardness is represented by the degree of damage by a scratch test or the pencil hardness, and the pencil hardness is represented by the hardness of a pencil when scratched with a designated pencil. However, even if these methods can be adapted to, for example, bulk evaluation of a flat surface, they cannot be adapted to the evaluation of determining the shape retention of the fine concavo-convex structure.

本發明者等人發現,利用非常微細的針般的形狀的壓頭直接按入膜表面,利用此時的反彈力定義樹脂硬度的藉由奈米壓印法而求出的硬度成為適宜地表示複製模的形狀保持與樹脂硬度的關係的指標。The inventors of the present invention found that the use of a very fine needle-like indenter to directly press into the surface of the film, and the rebound force at this time to define the hardness of the resin, the hardness obtained by the nanoimprint method becomes a suitable representation for replication. An index of the relationship between mold shape retention and resin hardness.

具體而言,如以下的評價方法2般進行而測定的、光硬化後的光硬化性組成物的硬度較佳為0.05 GPa~0.5 GPa,更佳為0.1 GPa~0.5 GPa,進而佳為0.15 GPa~0.5 GPa。於超過上限值的情況下,樹脂表面變得硬脆,即使是微小的外部應力,凹凸形狀亦無法保持缺口形狀,且無法承受用於輥對輥製程時的輥的彎曲率而凹凸形狀產生裂紋。進而,於小於下限值的情況下,因樹脂柔軟且與第二光硬化性組成物接液並加以壓接時的應力而樹脂發生變形,例如有時會引起向T頂的形狀變化,因錨定效果而無法剝離。Specifically, the hardness of the photocurable composition after photocuring, measured as in the following evaluation method 2, is preferably 0.05 GPa to 0.5 GPa, more preferably 0.1 GPa to 0.5 GPa, and still more preferably 0.15 GPa ~0.5 GPa. When the upper limit is exceeded, the resin surface becomes hard and brittle. Even with a slight external stress, the uneven shape cannot maintain the notched shape, and cannot withstand the curvature of the roll used in the roll-to-roll process, resulting in uneven shape. crack. Furthermore, when the value is less than the lower limit, the resin is deformed due to the stress when the resin is soft and the second photocurable composition is in contact with the liquid and pressure-bonded, for example, the shape of the T-top may change. Anchoring effect and cannot be peeled off.

[評價方法2] 首先,利用與所述評價方法1相同的方法來獲得硬化膜。 其次,使用奈米壓痕儀,將玻氏壓頭壓抵於所述硬化膜,並根據所檢測出的應力的值來算出硬度。[Evaluation Method 2] First, the cured film was obtained by the same method as the above-mentioned evaluation method 1. Next, a nanoindenter is used to press a Bosch indenter against the cured film, and the hardness is calculated based on the value of the detected stress.

<凹凸結構體、其製造方法> 可使用本實施形態的光硬化性組成物來製造包括基板及樹脂層的凹凸結構體(例如複製模),所述樹脂層設置於所述基板上且表面形成有微細凹凸。 以下,對基板的具體態樣或製作方法進行具體說明。<Concave-convex structure and its manufacturing method> The photocurable composition of this embodiment can be used to produce an uneven structure (for example, a replica mold) including a substrate and a resin layer on which the resin layer is provided with fine unevenness formed on the surface. Hereinafter, the specific aspect or production method of the substrate will be described in detail.

·關於基板 基板的原材料並無特別限定。基板例如包含有機材料或無機材料。另外,關於基板的形狀,例如可使用片狀、膜狀、板狀或多孔質狀的基板。·About the substrate The raw material of the substrate is not particularly limited. The substrate contains, for example, an organic material or an inorganic material. In addition, regarding the shape of the substrate, for example, a sheet-like, film-like, plate-like, or porous-like substrate can be used.

更具體而言,於基板包含有機材料的情況下,例如可將聚縮醛、聚醯胺、聚碳酸酯、聚苯醚、聚對苯二甲酸丁二酯、聚對苯二甲酸乙二酯、聚萘二甲酸乙二酯等聚酯;聚乙烯、聚丙烯等聚烯烴;聚(甲基)丙烯酸酯、聚碸、聚醚碸、聚苯硫醚、聚醚醚酮、聚醯亞胺、聚醚醯亞胺、聚乙醯纖維素、聚乙烯醇、聚胺基甲酸酯、聚偏二氟乙烯、聚四氟乙烯、六氟丙烯-四氟乙烯共聚物、全氟丙基乙烯基醚-四氟乙烯共聚物等氟樹脂等各種樹脂的一種或兩種以上作為原料。而且,可藉由利用射出成型、擠出成型、中空成形、熱成型、壓縮成形等方法來加工原料而製成基板。另外,作為多孔質狀基板,例如可列舉:於藉由發泡劑而多孔化的狀態下硬化而成的基板、藉由將無孔性的基材延伸來多孔化而成的基板、藉由雷射加工來多孔化而成的基板、纖維間具有多孔質結構的不織布等。More specifically, when the substrate contains an organic material, for example, polyacetal, polyamide, polycarbonate, polyphenylene ether, polybutylene terephthalate, polyethylene terephthalate , Polyesters such as polyethylene naphthalate; Polyolefins such as polyethylene and polypropylene; Poly(meth)acrylate, polyether, polyether sulfide, polyphenylene sulfide, polyether ether ketone, polyimide , Polyether imide, polyacetate cellulose, polyvinyl alcohol, polyurethane, polyvinylidene fluoride, polytetrafluoroethylene, hexafluoropropylene-tetrafluoroethylene copolymer, perfluoropropyl ethylene One or two or more of various resins such as fluororesin, such as base ether-tetrafluoroethylene copolymer, are used as raw materials. Moreover, the substrate can be made by processing raw materials by methods such as injection molding, extrusion molding, hollow molding, thermoforming, and compression molding. In addition, as a porous substrate, for example, a substrate hardened in a state of being porous by a foaming agent, a substrate made porous by stretching a non-porous base material, and A substrate made by laser processing to be porous, a non-woven fabric with a porous structure between fibers, etc.

另外,作為另一態樣,基板可為於聚合起始劑的存在下藉由光照射而使(甲基)丙烯酸酯、苯乙烯、環氧、氧雜環丁烷等光硬化性單體硬化而成的單層基板,或者將此種光硬化性單體塗佈於有機材料或無機材料上而成的基板等。In addition, as another aspect, the substrate may be cured by light irradiation in the presence of a polymerization initiator to cure a photocurable monomer such as (meth)acrylate, styrene, epoxy, and oxetane. Single-layer substrates, or substrates formed by coating such photocurable monomers on organic or inorganic materials.

於基板包含無機材料的情況下,作為其構成原材料,例如可列舉:銅、金、鉑、鎳、鋁、矽、不鏽鋼、石英、鈉玻璃、藍寶石、碳纖維等。When the substrate contains an inorganic material, as its constituent material, for example, copper, gold, platinum, nickel, aluminum, silicon, stainless steel, quartz, soda glass, sapphire, carbon fiber, etc. can be cited.

基板的構成材料不論是有機材料還是無機材料,為了使與光硬化性組成物及其硬化物的密接性良好,均可對基板的表面進行某些處理。作為此種處理,例如可列舉:電暈處理、大氣壓電漿處理、真空電漿處理、易接著塗佈處理等密接處理。 另外,基板的構成材料不論是有機材料還是無機材料,基板均可為單層,亦可為兩層以上的構成。Regardless of whether the constituent material of the substrate is an organic material or an inorganic material, in order to improve the adhesion with the photocurable composition and its cured product, some treatment may be performed on the surface of the substrate. Examples of such treatment include corona treatment, atmospheric pressure plasma treatment, vacuum plasma treatment, and adhesion treatment such as easy adhesion coating treatment. In addition, regardless of whether the constituent material of the substrate is an organic material or an inorganic material, the substrate may be a single layer, or may have a structure of two or more layers.

基板較佳為樹脂膜。基板例如較佳為包含所述樹脂的任一種的樹脂膜。藉由基板為樹脂膜而非無機材料,使用者可容易地裁斷成所期望的形狀或尺寸來使用。另外,具有於保管積層體時,可將積層體捲起、即省空間化的優點。The substrate is preferably a resin film. The substrate is preferably, for example, a resin film containing any of the above-mentioned resins. Since the substrate is a resin film instead of an inorganic material, the user can easily cut it into a desired shape or size for use. In addition, there is an advantage that the layered body can be rolled up when storing the layered body, that is, it is space-saving.

作為另一觀點,基板的光的透過性較佳為高。藉此,可獲得如下優點:於製作複製模時或使用時,(i)當製造凹凸結構體時,可自基板側接觸光而可促進硬化反應;或(ii)容易藉由目視來確認各種步驟;或(iii)容易自由地設計光照射的方向且提高裝置設計的自由度等。 就(i)的觀點而言,基板有時較佳為於所述光硬化起始劑進行反應的光的波長區域下的透過率高。更佳為以紫外區域的光的透過率高為宜。例如,200 nm~400 nm的波長的光的透過率較佳為50%~100%,更佳為70%~100%,進而佳為80%~100%。 就(ii)的觀點而言,較佳為基板的可見區域的光的透過率高。例如,500 nm~1000 nm的波長的光的透過率較佳為50%~100%,更佳為70%~100%,進而佳為80%~100%。 順便一說,大部分樹脂膜的透明性高,因此就光的透過性的方面而言,作為基板,亦可以說較佳為樹脂膜。As another viewpoint, the light transmittance of the substrate is preferably high. Thereby, the following advantages can be obtained: (i) when manufacturing a concave-convex structure, the hardening reaction can be promoted by exposure to light from the side of the substrate; or (ii) various types can be easily confirmed by visual inspection. Step; or (iii) It is easy to freely design the direction of light irradiation and increase the freedom of device design. From the viewpoint of (i), it is sometimes preferable that the substrate has a high transmittance in the wavelength region of light with which the photohardening initiator reacts. More preferably, the transmittance of light in the ultraviolet region is high. For example, the transmittance of light with a wavelength of 200 nm to 400 nm is preferably 50% to 100%, more preferably 70% to 100%, and still more preferably 80% to 100%. From the viewpoint of (ii), it is preferable that the transmittance of light in the visible region of the substrate is high. For example, the transmittance of light with a wavelength of 500 nm to 1000 nm is preferably 50% to 100%, more preferably 70% to 100%, and still more preferably 80% to 100%. By the way, most resin films have high transparency, so in terms of light transmittance, it can also be said that a resin film is preferable as a substrate.

基板的厚度並無特別限定。可根據各種目的、例如積層體的操作性的良好程度、所欲獲得的凹凸結構體的尺寸精度等而適宜調整。 基板的厚度例如為1 μm~10000 μm,具體而言為5 μm~5000 μm,更具體而言為10 μm~1000 μm。 基板整體的形狀並無特別限定。例如可為板狀、圓盤狀、輥狀等。The thickness of the substrate is not particularly limited. It can be appropriately adjusted according to various purposes, for example, the degree of operability of the laminate, the dimensional accuracy of the concavo-convex structure to be obtained, and the like. The thickness of the substrate is, for example, 1 μm to 10000 μm, specifically 5 μm to 5000 μm, and more specifically 10 μm to 1000 μm. The shape of the entire substrate is not particularly limited. For example, it may be plate-shaped, disk-shaped, roll-shaped, or the like.

·關於塗佈步驟 本實施形態的凹凸結構體的製造方法的具體程序並無特別限定。例如,可藉由包括使用本實施形態的光硬化性組成物而於基板的表面形成光硬化性組成物層的步驟(光硬化性層形成步驟)的步驟來製造。 形成光硬化性組成物層的步驟的具體方法並無特別限定,典型而言,首先,利用下述塗佈方法將光硬化性組成物塗佈於基板上而形成光硬化性層。·About coating steps The specific procedure of the manufacturing method of the concavo-convex structure of this embodiment is not particularly limited. For example, it can manufacture by the process including the process (photocurable layer formation process) of forming a photocurable composition layer on the surface of a board|substrate using the photocurable composition of this embodiment. The specific method of the step of forming the photocurable composition layer is not particularly limited. Typically, first, the photocurable composition is coated on the substrate by the following coating method to form the photocurable layer.

關於塗佈方法,可應用公知的方法。例如可列舉:平台塗佈(table coat)法、旋塗法、浸塗法、模塗法、噴塗法、棒塗法、輥塗法、簾幕流塗法、狹縫塗佈法、刮刀塗佈法、噴墨塗佈法、點膠法(dispense method)等。該些塗佈方法可考慮微細凹凸的形狀或尺寸、作為複製模的尺寸、生產性等而適宜選擇。Regarding the coating method, a known method can be applied. Examples include: table coating method, spin coating method, dip coating method, die coating method, spray coating method, bar coating method, roll coating method, curtain flow coating method, slit coating method, knife coating Cloth method, inkjet coating method, dispense method, etc. These coating methods can be appropriately selected in consideration of the shape or size of the fine concavities and convexities, the size of the replica mold, productivity, and the like.

另外,於光硬化性組成物包含溶劑的情況下,出於將溶劑去除的目的,可視需要於塗佈後設置烘烤(加熱)步驟。關於烘烤的溫度、時間等各條件,考慮塗敷厚度、製程樣式、生產性來適宜設定即可。於較佳為20℃~200℃、更佳為20℃~180℃的溫度範圍內且於0.5分鐘~30分鐘、更佳為0.5分鐘~20分鐘的時間內選擇。 烘烤的方法可為如下方法的任一種:藉由加熱板等直接進行加熱;於熱風爐中通過;利用紅外線加熱器等。In addition, when the photocurable composition contains a solvent, for the purpose of removing the solvent, a baking (heating) step may be provided after coating as necessary. Regarding the various conditions such as the baking temperature and time, it may be appropriately set in consideration of the coating thickness, process style, and productivity. It is selected within a temperature range of preferably 20°C to 200°C, more preferably 20°C to 180°C, and within a time period of 0.5 minutes to 30 minutes, more preferably 0.5 minutes to 20 minutes. The baking method can be any of the following methods: direct heating by a hot plate or the like; passing in a hot air stove; using an infrared heater or the like.

設置於基板上的光硬化性層的厚度較佳為0.05 μm~100 μm,更佳為0.10 μm~80 μm,進而佳為0.20 μm~50 μm的範圍。藉由使光硬化性層的厚度為所述範圍,可有效地進行複製模製作時的光硬化性組成物的光硬化。另外,例如,於考慮到輥對輥製程的情況下,即使施加與捲繞複製模的輥的彎曲率相對應的彎曲應力,亦可以無裂紋的產生等良好的狀態使用。The thickness of the photocurable layer provided on the substrate is preferably in the range of 0.05 μm to 100 μm, more preferably in the range of 0.10 μm to 80 μm, and still more preferably in the range of 0.20 μm to 50 μm. By setting the thickness of the photocurable layer within the above-mentioned range, the photocuring of the photocurable composition at the time of making the replica mold can be effectively performed. In addition, for example, considering the roll-to-roll process, even if a bending stress corresponding to the bending rate of the roll that is wound around the replica mold is applied, it can be used in a good state without the occurrence of cracks.

·關於壓接步驟 將表面具有凹凸結構的模具的凹凸面壓接於利用所述方法而形成於基板上的光硬化性層。藉此,將與模具的凹凸面對應的凹凸圖案轉印至光硬化性層。順便一說,此處的模具是根據被加工基板的凹凸加工而設計的模具,具體而言為母模。·About crimping steps The uneven surface of the mold having the uneven structure on the surface is press-bonded to the photocurable layer formed on the substrate by the above method. Thereby, the uneven pattern corresponding to the uneven surface of the mold is transferred to the photocurable layer. By the way, the mold here is a mold designed based on the uneven processing of the substrate to be processed, specifically a master mold.

模具(母模)的形狀並無特別限定。關於模具的凸部及凹部的形狀,可列舉:圓頂狀、四角柱狀、圓柱狀、角柱狀、四角錐狀、三角錐狀、多面體狀、半球狀等。關於模具的凸部及凹部的剖面形狀,可列舉:剖面四角形、剖面三角形、剖面半圓形等。 模具(母模)的凸部及/或凹部的寬度並無特別限定,例如為10 nm~100 μm,較佳為20 nm~70 μm。另外,凹部的深度及/或凸部的高度並無特別限定,例如為10 nm~100 μm,較佳為20 nm~70 μm。進而,凸部的寬度與凸部的高度的比即縱橫比較佳為0.1~500,更佳為0.5~20。The shape of the mold (master mold) is not particularly limited. Regarding the shape of the convex and concave portions of the mold, a dome shape, a quadrangular prism shape, a cylindrical shape, a prism shape, a quadrangular pyramid shape, a triangular pyramid shape, a polyhedron shape, a hemispherical shape, and the like can be mentioned. Regarding the cross-sectional shape of the convex portion and the concave portion of the mold, a quadrangular cross-section, a triangular cross-section, a semicircular cross-section, and the like can be cited. The width of the convex portion and/or concave portion of the mold (master mold) is not particularly limited, and is, for example, 10 nm to 100 μm, preferably 20 nm to 70 μm. In addition, the depth of the concave portion and/or the height of the convex portion is not particularly limited, and is, for example, 10 nm to 100 μm, preferably 20 nm to 70 μm. Furthermore, the ratio of the width of the convex portion to the height of the convex portion, that is, the aspect ratio, is preferably 0.1 to 500, and more preferably 0.5 to 20.

作為模具(母模)的材質,例如可列舉:鎳、鐵、不鏽鋼、鍺、鈦、矽等金屬材料;玻璃、石英、氧化鋁等無機材料;聚醯亞胺、聚醯胺、聚酯、聚碳酸酯、聚苯醚、聚苯硫醚、聚丙烯酸酯、聚甲基丙烯酸酯、聚芳酯、環氧樹脂、矽酮樹脂等樹脂材料;金剛石、石墨等碳材料等。As the material of the mold (master mold), for example, metal materials such as nickel, iron, stainless steel, germanium, titanium, and silicon; inorganic materials such as glass, quartz, and alumina; polyimide, polyamide, polyester, etc. Polycarbonate, polyphenylene ether, polyphenylene sulfide, polyacrylate, polymethacrylate, polyarylate, epoxy resin, silicone resin and other resin materials; carbon materials such as diamond and graphite.

關於壓接的方法,可利用公知的方法來進行。例如,可列舉於使光硬化性組成物層與模具的凹凸圖案接觸的狀態下,以適當的壓力進行按壓的方法。 壓力的上限並無特別限定。壓力的上限例如較佳為10 MPa以下,更佳為5 MPa以下,特佳為1 MPa以下。該壓力可根據模具的圖案形狀、縱橫比、材質等而適宜選擇。壓力的下限亦並不特別存在。只要光硬化性組成物層與模具的凹凸圖案對應地填充至各角落即可。壓力的上限例如為0.1 MPa以上。Regarding the method of crimping, a known method can be used. For example, a method of pressing with an appropriate pressure in a state where the photocurable composition layer is in contact with the uneven pattern of the mold is exemplified. The upper limit of the pressure is not particularly limited. The upper limit of the pressure is, for example, preferably 10 MPa or less, more preferably 5 MPa or less, and particularly preferably 1 MPa or less. The pressure can be appropriately selected according to the pattern shape, aspect ratio, material, etc. of the mold. The lower limit of pressure does not particularly exist. It is sufficient that the photocurable composition layer is filled in each corner corresponding to the concave-convex pattern of the mold. The upper limit of the pressure is, for example, 0.1 MPa or more.

壓接步驟可於大氣下實施,亦可於真空下、氮氣等惰性氣體、以及氟氣環境下實施。可根據光硬化性組成物的硬化性或排氣等脫氣、提高光硬化性組成物的填充速度等目的來適時選擇。The crimping step can be performed under the atmosphere, or under vacuum, inert gas such as nitrogen, and fluorine gas environment. It can be selected in a timely manner according to the curability of the photocurable composition, degassing such as exhaust, and improvement of the filling speed of the photocurable composition.

·光照射步驟 於光照射步驟中,對光硬化性層照射光。更具體而言,於在所述壓接步驟中施加壓力的狀態下(壓接模具的狀態下),對光硬化性層照射光。然後,使光硬化性層硬化。·Light irradiation steps In the light irradiation step, light is irradiated to the photocurable layer. More specifically, the photocurable layer is irradiated with light in a state where pressure is applied in the pressure bonding step (in the state of the pressure bonding mold). Then, the photocurable layer is cured.

作為所照射的光,只要可使光硬化性組成物層硬化,則並無特別限定。具體而言,可列舉:紫外線、可見光線、紅外線等。該些中,較佳為使光硬化起始劑產生自由基或離子的光。 作為光源,具體而言,可使用產生波長400 nm以下的光線的光源,例如可使用低壓水銀燈、中壓水銀燈、高壓水銀燈、超高壓水銀燈、化學燈(chemical lamp)、黑光燈(black light lamp)、微波激發水銀燈、金屬鹵化物燈、i射線、g射線、KrF準分子雷射光、ArF準分子雷射光等。 光照射的累計光量例如可設定為3 mJ/cm2 ~10000 mJ/cm2The light to be irradiated is not particularly limited as long as it can harden the photocurable composition layer. Specifically, ultraviolet rays, visible rays, infrared rays, and the like can be cited. Among these, it is preferable to cause the light to generate radicals or ions from the photohardening initiator. As the light source, specifically, a light source that generates light with a wavelength of 400 nm or less can be used. For example, a low-pressure mercury lamp, a medium-pressure mercury lamp, a high-pressure mercury lamp, an ultra-high-pressure mercury lamp, a chemical lamp, and a black light lamp can be used. , Microwave excited mercury lamp, metal halide lamp, i-ray, g-ray, KrF excimer laser light, ArF excimer laser light, etc. The cumulative light amount of light irradiation can be set to 3 mJ/cm 2 to 10000 mJ/cm 2, for example .

光照射可自形成有光硬化性組成物層的基板的背面或者模具(母模)的形成有凹凸結構的面的相反面的任一方向進行。特別是,考慮基板或模具的原材料(光的透過性等)來適時選擇即可。The light irradiation can be performed in either direction from the back surface of the substrate on which the photocurable composition layer is formed or the surface of the mold (master mold) opposite to the surface on which the concavo-convex structure is formed. In particular, it is only necessary to consider the material (transmittance of light, etc.) of the substrate or the mold and select it at the appropriate time.

出於促進光硬化性組成物層的硬化等目的,可併用光照射與加熱。且/或亦可於光照射步驟之後進行加熱步驟。 加熱的溫度較佳為室溫(通常是指25℃)以上、200℃以下,更佳為室溫以上、150℃以下。關於加熱的溫度,考慮基板、光硬化性組成物層及模具的耐熱性或由硬化促進引起的生產性提高等來適宜選擇即可。For the purpose of accelerating the curing of the photocurable composition layer, light irradiation and heating may be used in combination. And/or the heating step may be performed after the light irradiation step. The heating temperature is preferably room temperature (usually 25°C) or higher and 200°C or lower, and more preferably room temperature or higher and 150°C or lower. Regarding the heating temperature, it may be appropriately selected in consideration of the heat resistance of the substrate, the photocurable composition layer, and the mold, or the increase in productivity due to hardening acceleration, and the like.

·關於剝離步驟 本實施形態的凹凸結構體的製造方法較佳為包括模具剝離步驟。具體而言,將藉由所述光照射步驟而硬化的光硬化性層自模具分離,從而獲得於基板上形成有凹凸圖案的凹凸結構體。 關於模具剝離的方法,可應用公知的方法。例如,可以基板的端部為起點而將形成於基板上的樹脂層離與模具剝離。另外,亦可將具有黏著性的膠帶貼附於基板,以該膠帶為起點而將形成於基板上的樹脂層離與模具分離。進而,於利用輥對輥等連續法來實施的情況下,亦可為如下方法等:使輥以與步驟的圓周速度對應的速度旋轉,一邊對形成有形成於基板上的樹脂層離與凹凸圖案的凹凸結構體進行捲取一邊進行剝離。 藉由以上步驟而可製造模具(母模)的凹凸經反轉的凹凸結構體。·About the peeling step The manufacturing method of the concavo-convex structure of this embodiment preferably includes a mold peeling step. Specifically, the photocurable layer hardened by the light irradiation step is separated from the mold to obtain a concavo-convex structure in which a concavo-convex pattern is formed on the substrate. Regarding the method of mold peeling, a known method can be applied. For example, the end of the substrate can be used as a starting point to peel the resin delamination formed on the substrate from the mold. In addition, an adhesive tape may be attached to the substrate, and the resin layer formed on the substrate may be separated from the mold using the tape as a starting point. Furthermore, when it is implemented by a continuous method such as a roll-to-roll method, it may also be a method in which the roll is rotated at a speed corresponding to the circumferential speed of the step, and the resin delamination and unevenness formed on the substrate The patterned concavo-convex structure is peeled while being rolled up. Through the above steps, a concave-convex structure in which the concave-convex structure of the mold (mother mold) is reversed can be manufactured.

(複製模的使用方法) 複製模的使用方法並無特別限定。例如,可以與所述複製模的製作方法相同的方法來使用。於所述情況下,將所述稱為母模的模具替換為使本實施形態的光硬化性組成物(第一光硬化性組成物)硬化而成的表面具有凹凸結構的模具(複製模)。另外,作為光硬化性組成物(第二光硬化性組成物),可選擇具有與被加工基板的加工方法或各種用途(例如耐蝕刻性、透明性、硬度、氣體透過性等)對應的特性的材料。 進而,包含本發明的光硬化性組成物的複製模亦可於同種材料(第一光硬化性組成物)中重覆使用。例如,利用第一光硬化性組成物並根據複製模製作50張複製模,利用各複製模並使用第二光硬化性組成物來加工100張基板。藉此,可進行5000張(50×100)基板的加工,可防止複製模的劣化,同時高效地實施製品製造。(How to use copy mode) The method of using the copy mold is not particularly limited. For example, it can be used in the same way as the method of making the replica mold. In this case, the mold called the master mold is replaced with a mold (replica mold) that hardens the photocurable composition (first photocurable composition) of the present embodiment and has a concave-convex structure on the surface. . In addition, as a photocurable composition (second photocurable composition), it can be selected to have characteristics corresponding to the processing method of the substrate to be processed or various applications (for example, etching resistance, transparency, hardness, gas permeability, etc.) s material. Furthermore, the replica mold containing the photocurable composition of the present invention may be used repeatedly in the same material (first photocurable composition). For example, the first photocurable composition is used to create 50 replica molds from the replica mold, and 100 substrates are processed using each replica mold and the second photocurable composition. As a result, 5,000 (50×100) substrates can be processed, the deterioration of the copy mold can be prevented, and the product can be manufactured efficiently.

關於被加工基板的加工,例如,以電路形成為例進行說明,可例示於矽晶圓表面形成埋入銅的溝槽的方法。具體而言,如下所述。 首先,利用旋塗等方法將具有耐蝕刻性的光硬化性組成物塗佈矽晶圓上,壓接本發明的複製模,藉由光照射而使光硬化性組成物硬化並加以剝離。其次,以形成於矽晶圓上的凹凸結構為遮罩,藉由乾式蝕刻法來加工矽晶圓表面而形成凹凸結構。然後,埋入銅而完成電路。Regarding the processing of the substrate to be processed, for example, the circuit formation will be described as an example, and a method of forming a copper-embedded trench on the surface of a silicon wafer can be exemplified. Specifically, it is as follows. First, a photocurable composition having etching resistance is coated on a silicon wafer by spin coating or the like, and the replica mold of the present invention is crimped, and the photocurable composition is cured by light irradiation and peeled off. Secondly, with the uneven structure formed on the silicon wafer as a mask, the surface of the silicon wafer is processed by a dry etching method to form the uneven structure. Then, copper is buried to complete the circuit.

於進行此種製程時,若可重覆使用複製模,則可增大可自一張複製模加工的被加工基板的張數或面積,且可提高生產率。 總之,將包括由本實施形態的光硬化性組成物形成的、表面形成有微細凹凸的樹脂層的基板作為複製模來重覆使用而形成微細凹凸圖案,藉此可提高奈米壓印的生產性。即,藉由使用本實施形態的光硬化性組成物,可實現工業上生產性高的UV式奈米壓印製程。In such a process, if the copy mold can be used repeatedly, the number or area of the processed substrate that can be processed from a copy mold can be increased, and the productivity can be improved. In short, a substrate including a resin layer with fine concavities and convexities formed on the surface of the photocurable composition of the present embodiment is repeatedly used as a replica mold to form fine concavo-convex patterns, thereby improving the productivity of nanoimprinting. . That is, by using the photocurable composition of this embodiment, a UV-type nanoimprint process with high industrial productivity can be realized.

另外,關於本發明者等人的發現,本實施形態的光硬化性組成物具有如下特徵:圖案形狀的適應寬度自奈米廣至微米尺寸。藉此,除複製模的用途以外,本實施形態的光硬化性組成物亦可較佳地應用於複製模以外的用途(可利用一種光硬化性組成物良好地形成各種微細凹凸圖案)。In addition, regarding the findings of the present inventors, the photocurable composition of the present embodiment has the following characteristics: the adaptable width of the pattern shape is from nanometer to micrometer size. Thereby, in addition to the use of the replica mold, the photocurable composition of the present embodiment can also be preferably used for applications other than the replica mold (a photocurable composition can be used to form various fine concavo-convex patterns well).

以上,對本發明的實施形態進行了敘述,但該些為本發明的例示,可採用所述以外的多種構成。另外,本發明並不限定於所述實施形態,可達成本發明的目的的範圍內的變形、改良等包含於本發明中。 [實施例]The embodiments of the present invention have been described above, but these are examples of the present invention, and various configurations other than those described above can be adopted. In addition, the present invention is not limited to the above-mentioned embodiments, and modifications, improvements, etc. within the scope of achieving the object of the present invention are included in the present invention. [Example]

基於實施例對本發明的實施態樣進行說明。再者,本發明並不限定於實施例。The implementation aspects of the present invention will be described based on examples. In addition, the present invention is not limited to the examples.

首先,對以下內容進行說明。 ·市售品及所合成的光硬化性添加劑或黏合劑樹脂的分析法 ·表面自由能的測定方法(評價方法1)、硬度的測定方法(評價方法2) ·於奈米壓印製程中,所使用的模具、裝置、評價/分析方法等First, the following will be explained. ·Analysis method of commercially available products and synthesized light-curing additives or binder resins ·Surface free energy measurement method (evaluation method 1), hardness measurement method (evaluation method 2) ·In the nanoimprinting process, the molds, devices, evaluation/analysis methods, etc. used

[重量平均z(Mw)及分子量分佈(Mw/Mn)] 藉由凝膠滲透層析(GPC)來對後述的市售品及合成例中所示的添加劑的分子量進行測定。具體而言,於下述條件下,針對溶解於四氫呋喃(Tetrahydrofuran,THF)中的聚合物的重量平均分子量(Mw)及數量平均分子量(Mn),藉由聚苯乙烯標準來校正分子量並加以測定。 ·檢測器:日本分光公司製造、RI-2031及875-UV ·串聯連結管柱:Shodex K-806M、804、803、802.5 ·管柱溫度:40℃ ·流量:1.0 ml/分鐘 ·試樣濃度:3.0 mg/mL~9.0 mg/mL[Weight average z (Mw) and molecular weight distribution (Mw/Mn)] The molecular weights of the additives shown in the below-mentioned commercially available products and synthesis examples were measured by gel permeation chromatography (GPC). Specifically, under the following conditions, the weight average molecular weight (Mw) and number average molecular weight (Mn) of the polymer dissolved in tetrahydrofuran (Tetrahydrofuran, THF) are corrected by polystyrene standards and measured . ·Detector: RI-2031 and 875-UV manufactured by JASCO Corporation ·Tandem connection string: Shodex K-806M, 804, 803, 802.5 ·Column temperature: 40℃ ·Flow rate: 1.0 ml/min ·Sample concentration: 3.0 mg/mL~9.0 mg/mL

[含氟的環狀烯烴聚合物的氫化率] 將進行了氫化反應的添加劑的粉末溶解於氘化四氫呋喃中。針對所獲得者,藉由270 MHz-1 H-核磁共振(Nuclear Magnetic Resonance,NMR)測定來求出δ=4.5 ppm~7.0 ppm的主鏈的雙鍵碳上所鍵結的氫的訊號的積分值,並根據該積分值來算出氫化率。 於在δ=4.5 ppm~7.0 ppm的區域中未觀察到源自主鏈的雙鍵的氫的訊號的情況下,氫化率設為100%。[Hydrogenation rate of fluorine-containing cyclic olefin polymer] The powder of the additive subjected to the hydrogenation reaction was dissolved in deuterated tetrahydrofuran. For the obtained, the integral of the signal of hydrogen bonded to the double-bonded carbon of the main chain with δ=4.5 ppm~7.0 ppm was obtained by 270 MHz- 1 H-nuclear magnetic resonance (Nuclear Magnetic Resonance, NMR) measurement Value, and calculate the hydrogenation rate based on the integral value. In the case where a signal of hydrogen originating from a double bond of the main chain is not observed in the region of δ=4.5 ppm to 7.0 ppm, the hydrogenation rate is set to 100%.

[評價方法1:表面自由能的測定方法] 於聚對苯二甲酸乙二酯(Polyethylene Terephthalate,PET)膜基板(露米勒(Lumirror)U34、厚度188 μm、東麗公司製造)上,使用棒塗機將光硬化性組成物製膜。於光硬化性組成物包含溶劑的情況下,其後,於加熱板上以100℃進行1分鐘乾燥處理。藉此,形成光硬化性膜。 繼而,以2000 mJ/cm2 的累計光量照射波長365 nm的UV光(LED光源),使光硬化性膜硬化,從而製作厚度5 μm~6 μm的表面均勻的表面自由能測定用的樣品。[Evaluation method 1: Surface free energy measurement method] Used on a polyethylene terephthalate (PET) film substrate (Lumirror U34, thickness 188 μm, manufactured by Toray) The bar coater forms a film of the photocurable composition. When the photocurable composition contains a solvent, it is then dried on a hot plate at 100°C for 1 minute. Thereby, a photocurable film is formed. Next, UV light (LED light source) with a wavelength of 365 nm was irradiated with a cumulative light amount of 2000 mJ/cm 2 to harden the photocurable film to produce a sample for measuring surface free energy with a uniform surface with a thickness of 5 μm to 6 μm.

使用協和界面化學公司製造的接觸角計(A-XE型),並使用水、二碘甲烷、1-溴萘作為標準試驗液來測定樣品表面的接觸角。 為了算出表面自由能,利用基於所述Kitazaki-Hata理論的計算法,並使用標準試驗液的已知的表面自由能與標準試驗液於被檢體上的接觸角的測定值來算出。具體而言,計算中使用接觸角計上所附帶的應用軟體即多功能綜合解析軟體FAMAS(協和界面化學公司製造)。 實施例中所記載的數值是對一個樣品實施5次相同試驗而得的結果的平均值。A contact angle meter (A-XE type) manufactured by Kyowa Interface Chemical Co., Ltd., and water, diiodomethane, and 1-bromonaphthalene as standard test solutions were used to measure the contact angle of the sample surface. In order to calculate the surface free energy, the calculation method based on the Kitazaki-Hata theory is used, and the known surface free energy of the standard test liquid and the measured value of the contact angle of the standard test liquid on the object are used for calculation. Specifically, FAMAS (manufactured by Kyowa Interface Chemical Co., Ltd.), which is an application software attached to the contact angle meter, is used in the calculation. The numerical values described in the examples are the average values of the results obtained by performing the same test five times on one sample.

[評價方法2:硬度的測定方法] 首先,利用與評價方法1相同的方法來進行光硬化性膜的形成及光照射,獲得光硬化性組成物的硬化膜。 其次,使用奈米壓痕儀(TI-950特力波硬度計壓頭(Tribo Indenter)、海思創有限公司(Hysitron Inc.)製造),藉由依據作為奈米壓痕法的規格即ISO14577的壓痕試驗來測定樹脂硬度。針對硬化膜,將玻氏型壓頭壓抵至200 nm深度,根據所檢測出的應力值來算出23℃~25℃的室溫條件下的硬度(GPa)。 實施例中所記載的數值是對一個樣品實施5次相同試驗而得的結果的平均值。[Evaluation method 2: Hardness measurement method] First, formation of a photocurable film and light irradiation were performed by the same method as the evaluation method 1, and a cured film of the photocurable composition was obtained. Secondly, using a nano indenter (TI-950 Tribo Indenter, manufactured by Hysitron Inc.), based on the standard of the nano indentation method, that is, ISO14577 Indentation test to determine resin hardness. For the cured film, press the Bosnian indenter to a depth of 200 nm, and calculate the hardness (GPa) at room temperature from 23°C to 25°C based on the detected stress value. The numerical values described in the examples are the average values of the results obtained by performing the same test five times on one sample.

[所使用的模具(相當於母模)] 使用圖案形狀為線狀的線(凸部)與空間(凹部)的石英模具。 具體而言,於將凸部的寬度設為L1,將凹部的寬度設為L2,將凸部的高度設為L3時,使用以下的模具A及模具B。 ·模具A:L1=450 nm、L2=450 nm、L3=450 nm ·模具B:L1=75 nm、L2=75 nm、L3=150 nm[The mold used (equivalent to the master mold)] Use a quartz mold with a pattern of linear lines (convex parts) and spaces (concave parts). Specifically, when the width of the convex portion is L1, the width of the concave portion is L2, and the height of the convex portion is L3, the following mold A and mold B are used. ·Mold A: L1=450 nm, L2=450 nm, L3=450 nm ·Mold B: L1=75 nm, L2=75 nm, L3=150 nm

[凹凸結構體的製作中所使用的裝置] 光硬化性組成物(光硬化性膜)與模具的壓接及之後的UV照射使用UV式奈米壓印裝置X-100U(西瓦克斯(SCIVAX)公司製造)。UV光源是波長為365 nm的UV-LED光源。[Apparatus used in the production of concavo-convex structure] The light-curable composition (photocurable film) and the mold are crimped and the subsequent UV irradiation uses the UV-type nanoimprinting device X-100U (manufactured by Scivax). The UV light source is a UV-LED light source with a wavelength of 365 nm.

[凸部的尺寸測量] 凹凸結構的尺寸測量中使用掃描型電子顯微鏡JSM-6701F(日本分光公司製造,以下表述為SEM)。關於凸部寬度的測量,對圖案面的任意五個部位的線寬度進行測量,採用所獲得的五個值的平均值作為凸部寬度。[Measurement of the size of the convex part] A scanning electron microscope JSM-6701F (manufactured by JASCO Corporation, hereinafter referred to as SEM) was used for the size measurement of the uneven structure. Regarding the measurement of the convex portion width, the line width of any five locations on the pattern surface is measured, and the average value of the obtained five values is used as the convex portion width.

[作為複製模重覆使用時的凸部尺寸評價] 為了評價伴隨重覆使用的模具的劣化,於模具製作時、使用1次時及每使用10次,利用SEM來測量使用後的複製模的凸部寬度。於後述的表2中,只要無特別說明,則記載使用50次後的凸部寬度的測量值。[Evaluation of the size of the convex part when used repeatedly as a copy mold] In order to evaluate the deterioration of the mold accompanying repeated use, the width of the convex portion of the replica mold after use was measured by SEM at the time of mold production, when it was used once, and every 10 times. In Table 2 described later, unless otherwise specified, the measured value of the width of the convex portion after 50 uses is described.

以下,對具有光反應性官能基的添加劑及黏合劑樹脂的合成法、以及光硬化性組成物的製備法及評價結果進行記載。Hereinafter, the synthesis method of the additive and the binder resin having the photoreactive functional group, the preparation method of the photocurable composition, and the evaluation result will be described.

[合成例1]添加劑(C-1)的合成 首先,準備作為含氟的環狀烯烴單體的5,5,6-三氟-6-(三氟甲基)雙環[2.2.1]庚-2-烯(100 g)與1,2-環氧基-5-己烯(5.675 g)的四氫呋喃溶液。於該溶液中添加Mo(N-2,6-Pri 2 C6 H3 )(CHCMe2 Ph)(OBut)2 (85 mg)的四氫呋喃溶液,於70℃下進行開環複分解聚合。 繼而,使用作為固體觸媒的鈀氧化鋁(5 g),於160℃、24小時的條件下使所獲得的聚合物的烯烴部進行氫化反應,從而將主鏈的烯烴氫化。 藉由利用孔徑0.5 μm的過濾器對所獲得的溶液進行加壓過濾而將鈀氧化鋁去除,將所獲得的溶液排出至甲醇/己烷(50質量%/50質量%)混合溶液中,對白色的聚合物進行過濾分離並加以乾燥。 藉由以上所述而獲得95 g的白色粉末狀的聚合物(添加劑(C-1))。[Synthesis Example 1] Synthesis of Additive (C-1) First, prepare 5,5,6-trifluoro-6-(trifluoromethyl)bicyclo[2.2.1]heptane as a fluorine-containing cyclic olefin monomer -2-ene (100 g) and 1,2-epoxy-5-hexene (5.675 g) in tetrahydrofuran. A tetrahydrofuran solution of Mo(N-2,6-Pr i 2 C 6 H 3 )(CHCMe 2 Ph)(OBut) 2 (85 mg) was added to this solution, and the ring-opening metathesis polymerization was carried out at 70°C. Next, using palladium alumina (5 g) as a solid catalyst, the olefin part of the obtained polymer was subjected to a hydrogenation reaction at 160° C. for 24 hours to hydrogenate the olefin in the main chain. The palladium alumina was removed by pressure filtration of the obtained solution with a filter with a pore diameter of 0.5 μm, and the obtained solution was discharged into a methanol/hexane (50% by mass/50% by mass) mixed solution. The white polymer is separated by filtration and dried. As described above, 95 g of a white powdery polymer (additive (C-1)) was obtained.

根據1 H-NMR,添加劑(C-1)的氫化率為100%,於通式(2)所表示的結構中,L2 含有環氧基被氫還原的含羥基的脂肪族結構。重量平均分子量(Mw)為6050,分子量分佈(Mw/Mn)為1.49。According to 1 H-NMR, the hydrogenation rate of the additive (C-1) is 100%. In the structure represented by the general formula (2), L 2 contains a hydroxyl group-containing aliphatic structure in which an epoxy group is reduced by hydrogen. The weight average molecular weight (Mw) is 6050, and the molecular weight distribution (Mw/Mn) is 1.49.

[合成例2]添加劑(C-2)的合成 首先,將單體的種類變更為5,6-二氟-5-三氟甲基-6-全氟乙基雙環[2.2.1]庚-2-烯,除此以外,利用與合成例1相同的方法來進行開環複分解聚合。 繼而,使用作為均相觸媒的(Ph3 P)3 CORuHCl,於125℃、24小時的條件下使所獲得的聚合物的烯烴部進行氫化反應,從而將主鏈的烯烴氫化。 然後,將所獲得的溶液排出至甲醇中,對白色的聚合物進行過濾分離並加以乾燥,從而獲得98 g的白色粉末狀的聚合物(添加劑(C-2))。 根據1 H-NMR,添加劑(C-2)的氫化率為100%,於通式(2)所表示的結構中,L2 含有含環氧基的脂肪族結構。重量平均分子量(Mw)為6200,分子量分佈(Mw/Mn)為1.51。[Synthesis Example 2] Synthesis of Additive (C-2) First, the type of monomer was changed to 5,6-difluoro-5-trifluoromethyl-6-perfluoroethylbicyclo[2.2.1]hept- Except for this, the same method as in Synthesis Example 1 was used to carry out ring-opening metathesis polymerization. Next, using (Ph 3 P) 3 CORuHCl as a homogeneous catalyst, the olefin portion of the obtained polymer was subjected to a hydrogenation reaction at 125° C. for 24 hours to hydrogenate the olefin in the main chain. Then, the obtained solution was discharged into methanol, and the white polymer was separated by filtration and dried to obtain 98 g of a white powdery polymer (additive (C-2)). According to 1 H-NMR, the hydrogenation rate of the additive (C-2) is 100%, and in the structure represented by the general formula (2), L 2 contains an epoxy group-containing aliphatic structure. The weight average molecular weight (Mw) is 6200, and the molecular weight distribution (Mw/Mn) is 1.51.

[合成例3]黏合劑樹脂(B-1)的合成 首先,準備5,5,6-三氟-6-(三氟甲基)雙環[2.2.1]庚-2-烯(100 g)與1-己烯(0.298 mg)的四氫呋喃溶液。於該溶液中添加Mo(N-2,6-Pri 2 C6 H3 )(CHCMe2 Ph)(OBut)2 (50 mg)的四氫呋喃溶液,於70℃下進行開環複分解聚合。 繼而,利用鈀氧化鋁(5 g),於160℃下使所獲得的聚合物的烯烴部進行氫化反應,獲得聚(1,1,2-三氟-2-三氟甲基-3,5-伸環戊基乙烯)的四氫呋喃溶液。藉由利用孔徑5 μm的過濾器對所獲得的溶液進行加壓過濾而將鈀氧化鋁去除。 然後,將所獲得的溶液加入甲醇中,對白色的聚合物進行過濾分離並加以乾燥。藉此,獲得99 g的作為無反應性官能基的含氟的環狀烯烴聚合物的黏合劑樹脂(B-1)。黏合劑樹脂(B-1)的氫化率為100%,重量平均分子量(Mw)為70000,分子量分佈(Mw/Mn)為1.71。[Synthesis example 3] Synthesis of binder resin (B-1) First, prepare 5,5,6-trifluoro-6-(trifluoromethyl)bicyclo[2.2.1]hept-2-ene (100 g) With 1-hexene (0.298 mg) in tetrahydrofuran. A tetrahydrofuran solution of Mo(N-2,6-Pr i 2 C 6 H 3 )(CHCMe 2 Ph)(OBut) 2 (50 mg) was added to this solution, and ring-opening metathesis polymerization was carried out at 70°C. Then, using palladium alumina (5 g), the olefin part of the obtained polymer was hydrogenated at 160°C to obtain poly(1,1,2-trifluoro-2-trifluoromethyl-3,5). -Cyclopentylethylene) in tetrahydrofuran. The palladium alumina was removed by pressure filtration of the obtained solution with a filter with a pore diameter of 5 μm. Then, the obtained solution was added to methanol, and the white polymer was separated by filtration and dried. Thereby, 99 g of a binder resin (B-1) of a fluorine-containing cyclic olefin polymer which is a non-reactive functional group was obtained. The hydrogenation rate of the binder resin (B-1) was 100%, the weight average molecular weight (Mw) was 70,000, and the molecular weight distribution (Mw/Mn) was 1.71.

[實施例1]光硬化性組成物(1)的製備、複製模的製作等 首先,製備如下溶液:於作為光硬化性單體的雙(3-乙基-3-氧雜環丁基甲基)醚與3,4-環氧基環己基甲基-3',4'-環氧基環己烷羧酸酯的質量比7/3的混合物10 g中,加入作為添加劑的X-22-2000(信越矽酮(silicone)公司製造)0.05 g及作為光硬化起始劑的CPI-310B(三亞普羅(San-Apro)公司製造)1 g而成的溶液。 (X-22-2000表示於通式(1)中R1 =甲基、L1 =環氧基、甲基及苯基,分子量(Mw)為7300) 繼而,利用孔徑1 μm的過濾器對該溶液進行加壓過濾,進而利用孔徑0.1 μm的過濾器進行過濾。藉由以上所述而製備光硬化性組成物(1)。[Example 1] Preparation of photocurable composition (1), production of replica mold, etc. First, the following solution was prepared: bis(3-ethyl-3-oxetanylmethyl) as a photocurable monomer 10 g of a mixture of ether and 3,4-epoxycyclohexylmethyl-3',4'-epoxycyclohexane carboxylate in a mass ratio of 7/3, add X-22-2000 as an additive (Manufactured by Shin-Etsu Silicone) 0.05 g and 1 g of CPI-310B (manufactured by San-Apro) as a light hardening initiator. (X-22-2000 is represented in the general formula (1) where R 1 = methyl, L 1 = epoxy, methyl and phenyl, molecular weight (Mw) is 7300) Then, use a filter with a pore size of 1 μm to This solution was pressure-filtered, and then filtered with a filter with a pore size of 0.1 μm. The photocurable composition (1) was prepared as described above.

使用所獲得的光硬化性組成物(1),依據評價方法1及評價方法2,製作利用LED光源進行了硬化的樹脂膜並加以評價。表面自由能為26.2 mJ/m2 ,表面硬度為0.28 GPa。Using the obtained photocurable composition (1), according to Evaluation Method 1 and Evaluation Method 2, a resin film cured with an LED light source was produced and evaluated. The surface free energy is 26.2 mJ/m 2 , and the surface hardness is 0.28 GPa.

利用與評價方法1相同的方法將光硬化性組成物(1)於PET基板上製膜後,使用所述奈米壓印裝置,將大氣面以0.2 MPa表壓的壓力分別壓接於模具A或模具B。一邊保持施加有壓力的狀態,一邊自PET膜基板背面側以2000 mJ/cm2 的累計光量進行光照射,從而使光硬化性組成物(1)硬化。 自模具剝離形成於PET膜基板上的硬化膜,獲得表面具有線與空間結構的複製模A-1(根據石英模具A而製作)或複製模B-1(根據石英模具B而製作)。 利用SEM來測量所製作的複製模的凸部寬度。複製模A-1為449 nm,複製模B-1為74 nm。 進而,切出複製模B-1的剖面,利用飛行時間型二次離子質譜法(TOF-SIMS)來映射剖面的元素離子的狀態。結果觀察到兩層的剖面狀態,於該兩層中的大氣面側檢測出歸屬於添加劑的X-22-2000的包含矽的片段的負離子(圖1所示)。After forming a film on the PET substrate with the photocurable composition (1) by the same method as the evaluation method 1, using the nanoimprinting device, the atmospheric surface was press-bonded to the mold A or the mold at a pressure of 0.2 MPa gauge pressure. Mold B. While maintaining the pressure applied, light was irradiated with a cumulative light quantity of 2000 mJ/cm 2 from the back side of the PET film substrate to cure the photocurable composition (1). The cured film formed on the PET film substrate was peeled from the mold to obtain a replica A-1 (made from the quartz mold A) or a replica B-1 (made from the quartz mold B) with a line and space structure on the surface. SEM was used to measure the width of the convex part of the produced replica mold. The replica mode A-1 is 449 nm, and the replica mode B-1 is 74 nm. Furthermore, the cross section of the replica B-1 was cut out, and the state of the element ions in the cross section was mapped by TOF-SIMS. As a result, the cross-sectional state of the two layers was observed, and the negative ions of the X-22-2000 silicon-containing fragments belonging to the additive were detected on the atmospheric surface side of the two layers (shown in Fig. 1).

[實施例2]光硬化性組成物(2)的製備、複製模的製作等 製備如下溶液:於作為光硬化性單體的雙(3-乙基-3-氧雜環丁基甲基)醚與3,4-環氧基環己基甲基-3',4'-環氧基環己烷羧酸酯的質量比7/3的混合物9.5 g中,加入作為添加劑的合成例1中所合成的添加劑(C-1)0.5 g及作為光硬化起始劑的CPI-310B(三亞普羅(San-Apro)公司製造)0.95 g而成的溶液。 繼而,與實施例1同樣地製備而製備光硬化性組成物(2)。[Example 2] Preparation of photocurable composition (2), preparation of replica mold, etc. Prepare the following solution: bis(3-ethyl-3-oxetanylmethyl) ether as a photocurable monomer and 3,4-epoxycyclohexylmethyl-3',4'-epoxy To 9.5 g of a mixture of cyclohexane carboxylate with a mass ratio of 7/3, 0.5 g of the additive (C-1) synthesized in Synthesis Example 1 as an additive and CPI-310B (Sanya) as a light hardening initiator were added Pro (manufactured by San-Apro) 0.95 g solution. Then, it prepared in the same manner as in Example 1 to prepare a photocurable composition (2).

使用所獲得的光硬化性組成物(2),依據評價方法1及評價方法2,製作利用LED光源進行了硬化的樹脂膜並加以評價。表面自由能為32.0 mJ/m2 ,表面硬度為0.22 GPa。 另外,利用與實施例1相同的方法所製作的複製模A-2的凸部寬度為449 nm,複製模B-2的凸部寬度為73 nm。Using the obtained photocurable composition (2), according to Evaluation Method 1 and Evaluation Method 2, a resin film cured with an LED light source was produced and evaluated. The surface free energy is 32.0 mJ/m 2 , and the surface hardness is 0.22 GPa. In addition, the width of the convex portion of the replica A-2 produced by the same method as in Example 1 was 449 nm, and the width of the convex portion of the replica B-2 was 73 nm.

[實施例3]光硬化性組成物(3)的製備、複製模的製作等 使用作為添加劑的X-22-2000(信越矽酮(silicone)公司製造)0.1 g及添加劑(C-1)0.05 g,除此以外,與實施例1同樣地製備光硬化性組成物(3)。[Example 3] Preparation of photocurable composition (3), preparation of replica mold, etc. A photocurable composition (3) was prepared in the same manner as in Example 1, except that 0.1 g of X-22-2000 (manufactured by Shin-Etsu Silicone Co., Ltd.) and 0.05 g of the additive (C-1) were used as additives .

使用所獲得的光硬化性組成物(3),依據評價方法1及評價方法2,製作利用LED光源進行了硬化的樹脂膜並加以評價。表面自由能為36.8 mJ/m2 ,硬度為0.25 GPa。 另外,利用與實施例1相同的方法所製作的複製模A-3的凸部寬度為450 nm,複製模B-2的凸部寬度為75 nm。Using the obtained photocurable composition (3), according to Evaluation Method 1 and Evaluation Method 2, a resin film cured with an LED light source was produced and evaluated. The surface free energy is 36.8 mJ/m 2 and the hardness is 0.25 GPa. In addition, the width of the convex portion of the replica A-3 produced by the same method as in Example 1 was 450 nm, and the width of the convex portion of the replica B-2 was 75 nm.

[實施例4]光硬化性組成物(4)的製備、複製模的製作等 製備如下溶液:於作為光硬化性單體的檸檬烯二氧化物10 g中,加入作為添加劑的BY16-876(東麗道康寧(Toray-Dow corning)公司製造)0.1 g及添加劑(C-1)0.05 g、作為光硬化起始劑的CPI-310B(三亞普羅(San-Apro)公司製造)0.5 g、以及增感劑(昂特拉固(Anthracure)UVS-1331、川崎化成工業公司製造)0.1 g而成的溶液。 (BY16-876表示於通式(1)中R1 =甲基、L1 =環氧基、甲基及聚醚基,分子量(Mw)為25000) 繼而,與實施例1同樣地製備而獲得光硬化性組成物(4)。[Example 4] Preparation of photocurable composition (4), production of replica molds, etc. The following solutions were prepared: 10 g of limonene dioxide as a photocurable monomer was added as an additive BY16-876 (East Toray-Dow Corning (manufactured by Toray-Dow Corning) 0.1 g and additive (C-1) 0.05 g, CPI-310B (manufactured by San-Apro) as a light hardening initiator 0.5 g, and sensitization (Anthracure UVS-1331, manufactured by Kawasaki Chemical Industry Co., Ltd.) 0.1 g. (BY16-876 is represented in the general formula (1) where R 1 = methyl, L 1 = epoxy, methyl, and polyether group, and the molecular weight (Mw) is 25000) Then, it was prepared in the same manner as in Example 1 to obtain Light-curable composition (4).

使用所獲得的光硬化性組成物(4),依據評價方法1及評價方法2,製作利用LED光源進行了硬化的樹脂膜並加以評價。表面自由能為33.2 mJ/m2 ,硬度為0.24 GPa。 另外,利用與實施例1相同的方法所製作的複製模A-4的凸部寬度為448 nm,複製模B-4的凸部寬度為74 nm。Using the obtained photocurable composition (4), according to Evaluation Method 1 and Evaluation Method 2, a resin film cured with an LED light source was produced and evaluated. The surface free energy is 33.2 mJ/m 2 and the hardness is 0.24 GPa. In addition, the width of the convex portion of the replica A-4 produced by the same method as in Example 1 was 448 nm, and the width of the convex portion of the replica B-4 was 74 nm.

[實施例5]光硬化性組成物(5)的製備、複製模的製作等 製備如下溶液:於作為光硬化性單體的雙(3-乙基-3-氧雜環丁基甲基)醚與3,4-環氧基環己基甲基-3',4'-環氧基環己烷羧酸酯的質量比7/3的混合物10 g中,加入合成例3中所合成的黏合劑樹脂(B-1)2.5 g及作為添加劑的X-22-2000(信越矽酮(silicone)公司製造)0.05 g、以及作為光硬化起始劑的CPI-310B(三亞普羅(San-Apro)公司製造)1 g而成的溶液。 繼而,與實施例1同樣地調整而獲得光硬化性組成物(5)。[Example 5] Preparation of photocurable composition (5), preparation of replica mold, etc. Prepare the following solution: bis(3-ethyl-3-oxetanylmethyl) ether as a photocurable monomer and 3,4-epoxycyclohexylmethyl-3',4'-epoxy To 10 g of a mixture of cyclohexane carboxylate with a mass ratio of 7/3, 2.5 g of the binder resin (B-1) synthesized in Synthesis Example 3 and X-22-2000 (Shin-Etsu Silicone (Shin-Etsu Silicone ( Silicone) 0.05 g and 1 g of CPI-310B (manufactured by San-Apro) as a photohardening initiator. Then, it adjusted similarly to Example 1, and obtained the photocurable composition (5).

使用所獲得的光硬化性組成物(5),依據評價方法1及評價方法2,製作利用LED光源進行了硬化的樹脂膜並加以評價。表面自由能為34.2 mJ/m2 ,硬度為0.23 GPa。 另外,利用與實施例1相同的方法所製作的複製模A-5的凸部寬度為450 nm,複製模B-5的凸部寬度為74 nm。Using the obtained photocurable composition (5), according to Evaluation Method 1 and Evaluation Method 2, a resin film cured with an LED light source was produced and evaluated. The surface free energy is 34.2 mJ/m 2 and the hardness is 0.23 GPa. In addition, the width of the convex portion of the replica A-5 produced by the same method as in Example 1 was 450 nm, and the width of the convex portion of the replica B-5 was 74 nm.

[實施例6]光硬化性組成物(6)的製備、複製模的製作等 除使用合成例2中所合成的添加劑(C-2)作為添加劑以外,與實施例2同樣地獲得光硬化性組成物(6)。[Example 6] Preparation of photocurable composition (6), preparation of replica mold, etc. A photocurable composition (6) was obtained in the same manner as in Example 2 except that the additive (C-2) synthesized in Synthesis Example 2 was used as an additive.

使用所獲得的光硬化性組成物(6),依據評價方法1及評價方法2,製作利用LED光源進行了硬化的樹脂膜並加以評價。表面自由能為28.5 mJ/m2 ,硬度為0.25 GPa。 另外,利用與實施例1相同的方法所製作的複製模A-6的凸部寬度為448 nm,複製模B-6的凸部寬度為74 nm。Using the obtained photocurable composition (6), according to Evaluation Method 1 and Evaluation Method 2, a resin film cured with an LED light source was produced and evaluated. The surface free energy is 28.5 mJ/m 2 and the hardness is 0.25 GPa. In addition, the width of the convex portion of the replica A-6 produced by the same method as in Example 1 was 448 nm, and the width of the convex portion of the replica B-6 was 74 nm.

[實施例7]光硬化性組成物(7)的製備、複製模的製作等 將實施例3的光硬化性組成物(3)的作為添加劑的X-22-2000(信越矽酮(silicone)公司製造)變更為FM-DA11(捷恩智(JNC)公司製造),除此以外,利用與實施例3相同的方法而獲得光硬化性組成物(7)。 使用所獲得的光硬化性組成物(7),依據評價方法1及評價方法2,製作利用LED光源進行了硬化的樹脂膜並加以評價。表面自由能為25.7 mJ/m2 ,硬度為0.27 GPa。 另外,利用與實施例1相同的方法所製作的複製模A-7的凸部寬度為448 nm,複製模B-7的凸部寬度為74 nm。[Example 7] Preparation of the photocurable composition (7), production of replica molds, etc. X-22-2000 (Shin-Etsu silicone) was used as an additive of the photocurable composition (3) of Example 3 Except that it was changed to FM-DA11 (manufactured by JNC), the photocurable composition (7) was obtained by the same method as in Example 3. Using the obtained photocurable composition (7), according to Evaluation Method 1 and Evaluation Method 2, a resin film cured with an LED light source was produced and evaluated. The surface free energy is 25.7 mJ/m 2 and the hardness is 0.27 GPa. In addition, the width of the convex portion of the replica A-7 produced by the same method as in Example 1 was 448 nm, and the width of the convex portion of the replica B-7 was 74 nm.

[作為複製模於非同種材料中的重覆使用性的評價] ·使用複製模A-1及實施例2至實施例7中所製作的複製模(A-2~A-7)的重覆使用評價例: 首先,準備如下親水化無鹼玻璃基板:藉由氮氣大氣壓電漿處理,以使水接觸角成為4°以下的方式對無鹼玻璃基板進行親水化處理而得的親水化無鹼玻璃基板。 其次,於該基板上,藉由旋塗法來塗佈作為第二光硬化性組成物的市售的奈米壓印材料(PAK-01、東洋合成公司製造)。[Evaluation of repeated usability as a copy model in different materials] · Example of repeated use evaluation using the replica model A-1 and the replica models (A-2 to A-7) produced in Example 2 to Example 7: First, a hydrophilized alkali-free glass substrate is prepared: a hydrophilized alkali-free glass substrate is hydrophilized by a nitrogen atmosphere piezoelectric slurry treatment to hydrophilize the alkali-free glass substrate so that the water contact angle becomes 4° or less. Next, on the substrate, a commercially available nanoimprint material (PAK-01, manufactured by Toyo Gosei Co., Ltd.) was applied as the second photocurable composition by a spin coating method.

使用所述奈米壓印裝置,將複製模A-1的凹凸面以0.2 MPa的表壓壓力壓接於所述獲得的塗膜面。於維持壓力的狀態下,自複製模的背面側以6000 mJ/cm2 的累計光量進行光照射而使塗膜硬化。然後,剝離複製模A-1,從而獲得表面形成有凹凸結構的包含第二光硬化性組成物的轉印體A-1(根據複製模A-1而製作)。Using the nanoimprinting device, the uneven surface of the replica A-1 was crimped to the obtained coating film surface under a gauge pressure of 0.2 MPa. While maintaining the pressure, the back side of the replica mold was irradiated with light with an accumulated light amount of 6000 mJ/cm 2 to harden the coating film. Then, the copy mold A-1 was peeled off to obtain a transfer body A-1 (made from the copy mold A-1) containing the second photocurable composition with the uneven structure formed on the surface.

複製模A-1的重覆使用性是藉由如下方式來評價:重覆實施所述自對無鹼玻璃基板塗佈第二光硬化性組成物至剝離複製模A-1的步驟。 利用SEM來測量重覆使用50次後的複製模A-1的凸部寬度,結果為449 nm。即,製作時(以複製模的形式使用前)的凸部寬度未發生變動。The reusability of the replica mold A-1 was evaluated by repeating the steps of applying the second photocurable composition to the alkali-free glass substrate to peeling off the replica mold A-1. The width of the convex part of the replica A-1 after 50 times of repeated use was measured by SEM, and the result was 449 nm. That is, the width of the convex portion at the time of production (before use as a replica mold) did not change.

·使用實施例1中所製作的複製模B-1及實施例2至實施例7中所製作的複製模(B-2~B-7)的重覆使用評價例: 除替換所使用的複製模以外,利用與所述複製模A-1相同的方法將各複製模重覆使用50次。對重覆使用後的複製模的凸部寬度進行測量,結果任一複製模中,製作時的凸部寬度均未發生變動。· Example of repeated use evaluation using the replica B-1 made in Example 1 and the replica molds (B-2 to B-7) made in Example 2 to Example 7: Except for replacing the used copy mold, each copy mold was repeatedly used 50 times by the same method as the copy mold A-1. The width of the convex portion of the replicated mold after repeated use was measured, and the width of the convex portion at the time of production did not change in any of the replicated molds.

根據以上所述,即使使用與製作複製模的材料相同的光硬化性組成物,亦可重覆使用。即,複製模於非同種材料中亦可重覆使用。According to the above, even if the same photocurable composition as the material used to make the replica mold is used, it can be used repeatedly. That is, the copy mold can be used repeatedly in different materials.

[作為複製模於同種材料中的重覆使用性的評價] ·使用實施例1中所製作的複製模A-1及實施例2至實施例7中所製作的複製模(A-2~A-7)的重覆使用評價例: 於PET基板上,藉由旋塗法來塗佈作為第二光硬化性組成物的實施例1中所使用的光硬化性組成物(1)。[Evaluation of repeated usability as a copy model in the same material] · Example of repeated use evaluation using the replica A-1 made in Example 1 and the replica molds (A-2 to A-7) made in Example 2 to Example 7: On the PET substrate, the photocurable composition (1) used in Example 1 as the second photocurable composition was coated by a spin coating method.

使用所述奈米壓印裝置,將複製模A-1的凹凸面以0.2 MPa的表壓壓力壓接於所述獲得的塗膜面。於維持壓力的狀態下,自複製模的背面側以6000 mJ/cm2 的累計光量進行光照射而使塗膜硬化。然後,剝離複製模A-1,從而獲得表面形成有凹凸結構的包含作為第二光硬化性組成物且為同種材料的光硬化性組成物(1)的轉印體A-1(根據複製模A-1而製作)。Using the nanoimprinting device, the uneven surface of the replica A-1 was crimped to the obtained coating film surface under a gauge pressure of 0.2 MPa. While maintaining the pressure, the back side of the replica mold was irradiated with light with an accumulated light amount of 6000 mJ/cm 2 to harden the coating film. Then, the copy mold A-1 was peeled off, thereby obtaining a transfer body A-1 (according to the copy mold) containing the photocurable composition (1) as the second photocurable composition and the same material with the uneven structure formed on the surface. A-1 and produced).

複製模A-1的重覆使用性是藉由如下方式來評價:重覆實施所述自塗佈作為第二光硬化性組成物的實施例1中所使用的光硬化性組成物(1)至剝離複製模A-1的步驟。The repeatability of the replica A-1 was evaluated by repeating the self-coating as the second photocurable composition of the photocurable composition (1) used in Example 1 Go to the step of peeling off the replica A-1.

利用SEM來測量重覆使用50次後的複製模A-1的凸部寬度,結果為449 nm。即,製作時(以複製模的形式使用前)的凸部寬度未發生變動,且外觀上亦無不良情況。 除替換所使用的複製模以外,利用與所述複製模A-1相同的方法將各複製模重覆使用50次。對重覆使用後的複製模的凸部寬度進行測量,結果任一複製模中,製作時的凸部寬度均未發生變動,且外觀上亦均無不良情況。The width of the convex part of the replica A-1 after 50 times of repeated use was measured by SEM, and the result was 449 nm. That is, there is no change in the width of the convex portion at the time of production (before use as a replica mold), and there is no defect in appearance. Except for replacing the used copy mold, each copy mold was repeatedly used 50 times by the same method as the copy mold A-1. The width of the convex portion of the replica mold after repeated use was measured. As a result, in any replica mold, the width of the convex portion during production did not change, and there was no defect in appearance.

·使用實施例1中所製作的複製模B-1及實施例2至實施例7中所製作的複製模(B-2~B-7)的重覆使用評價例: 除替換所使用的複製模以外,利用與所述複製模A-1相同的方法將各複製模重覆使用50次。對重覆使用後的複製模的凸部寬度進行測量,結果任一複製模中,製作時的凸部寬度均未發生變動,且外觀上亦均無不良情況。· Example of repeated use evaluation using the replica B-1 made in Example 1 and the replica molds (B-2 to B-7) made in Example 2 to Example 7: Except for replacing the used copy mold, each copy mold was repeatedly used 50 times by the same method as the copy mold A-1. The width of the convex portion of the replica mold after repeated use was measured. As a result, in any replica mold, the width of the convex portion during production did not change, and there was no defect in appearance.

根據以上所述,即使使用與製作複製模的材料相同的光硬化性組成物,亦可重覆使用。即,複製模於同種材料中亦可重覆使用。According to the above, even if the same photocurable composition as the material used to make the replica mold is used, it can be used repeatedly. That is, the copy mold can be used repeatedly in the same material.

[比較例1]光硬化性組成物(8)的製備等 製備如下溶液:於作為光硬化性單體的甲基丙烯酸甲酯10 g中加入作為光硬化起始劑的豔佳固(Irgacure)184(日本巴斯夫(BASF)公司製造)0.2 g而成的溶液。繼而,與實施例1同樣地製備而獲得光硬化性組成物(8)。[Comparative Example 1] Preparation of photocurable composition (8), etc. The following solution was prepared: a solution of 0.2 g of Irgacure 184 (manufactured by BASF) as a light hardening initiator added to 10 g of methyl methacrylate as a light hardening monomer . Then, it prepared in the same manner as in Example 1 to obtain a photocurable composition (8).

使用所獲得的光硬化性組成物(8),依據評價方法1及評價方法2,製作利用LED光源進行了硬化的樹脂膜並加以評價。表面自由能為42.7 mJ/m2 ,硬度為0.35 GPa。 利用與實施例1相同的方法所製作的複製模A-8的凸部寬度為405 nm,複製模B-8的凸部寬度為68 nm。 另外,利用與所述「作為複製模於非同種材料中的重覆使用性的評價」相同的方法來評價重覆使用性。複製模A-8及複製模B-8的任一者均於使用1次後,以目視可知的程度附著有第二光硬化性組成物的殘渣。另外,SEM觀察的結果是以填埋線與線之間的形式附著有第二光硬化性組成物的殘渣。 進而,利用與所述「作為複製模於同種材料中的重覆使用性的評價」相同的方法來評價重覆使用性,但於使複製模A-8或複製模B-8與光硬化性組成物(8)接觸的瞬間,複製模的硬化樹脂層溶解,無法實施下一步驟。即,無法於同種材料中重覆使用。Using the obtained photocurable composition (8), according to Evaluation Method 1 and Evaluation Method 2, a resin film cured with an LED light source was produced and evaluated. The surface free energy is 42.7 mJ/m 2 and the hardness is 0.35 GPa. The width of the convex portion of the replica A-8 produced by the same method as in Example 1 was 405 nm, and the width of the convex portion of the replica B-8 was 68 nm. In addition, the same method as the above-mentioned "Evaluation of Repeatability as a Copy Model in Different Materials" was used to evaluate the repeatability. After both the replica A-8 and the replica B-8 were used once, the residue of the second photocurable composition adhered to an extent that was visually apparent. In addition, the result of SEM observation was that the residue of the second photocurable composition adhered between the buried wire and the wire. Furthermore, the same method as the above-mentioned "evaluation of repeatability in the same material as a replica mold" was used to evaluate the repeatability, but the replica mold A-8 or the replica mold B-8 was compared with the photocuring properties. At the moment when the composition (8) is in contact, the hardened resin layer of the replica mold is dissolved and the next step cannot be carried out. That is, it cannot be used repeatedly in the same material.

[比較例2]光硬化性組成物(9)的製備等 製備如下溶液:於作為光硬化性單體的季戊四醇三丙烯酸酯卡亞拉德(KAYARAD)-PET-30(日本化藥公司製造)與多官能丙烯酸酯聚合物BS371(荒川化學工業公司製造)的質量比4/1的混合物10 g中,加入作為光硬化起始劑的豔佳固(Irgacure)184(日本巴斯夫(BASF)公司製造)0.4 g,並溶解於乙酸甲酯與甲基乙基酮(Methyl Ethyl Ketone,MEK)的質量比3/2的混合物10 g中而成的溶液。繼而,與實施例1同樣地進行過濾而製備光硬化性組成物(9)。[Comparative Example 2] Preparation of photocurable composition (9), etc. The following solution was prepared: a combination of pentaerythritol triacrylate (KAYARAD)-PET-30 (manufactured by Nippon Kayaku Co., Ltd.) as a photocurable monomer and multifunctional acrylate polymer BS371 (manufactured by Arakawa Chemical Industry Co., Ltd.) Add 0.4 g of Irgacure 184 (manufactured by BASF) as a light hardening initiator to 10 g of a mixture with a mass ratio of 4/1, and dissolve it in methyl acetate and methyl ethyl ketone (Methyl Ethyl Ketone, MEK) is a solution of 10 g of a mixture with a mass ratio of 3/2. Then, filtration was performed in the same manner as in Example 1 to prepare a photocurable composition (9).

使用所獲得的光硬化性組成物(9),依據評價方法1及評價方法2,製作利用LED光源進行了硬化的樹脂膜並加以評價。表面自由能為37.7 mJ/m2 ,硬度為0.83 GPa。 另外,利用與實施例1相同的方法所製作的複製模A-9的凸部寬度為415 nm,複製模B-9的凸部寬度為69 nm。 進而,利用與所述「作為複製模於非同種材料中的重覆使用性的評價」相同的方法來評價重覆使用性。複製模A-9及複製模B-9的任一者中,於使用1次後的複製模的表面,於SEM觀察時均未觀察到第二光硬化性組成物的殘渣附著。但是,線產生裂紋,於使用10次後,線的多個部位斷裂。 進而,利用與所述「作為複製模於同種材料中的重覆使用性的評價」相同的方法來評價重覆使用性。複製模A-9或複製模B-9的任一者均於使用1次後,未觀察到光硬化性組成物(9)的殘渣附著,但線產生裂紋,於使用10次後,線的多個部位斷裂。Using the obtained photocurable composition (9), according to Evaluation Method 1 and Evaluation Method 2, a resin film cured with an LED light source was produced and evaluated. The surface free energy is 37.7 mJ/m 2 and the hardness is 0.83 GPa. In addition, the width of the convex portion of the replica A-9 produced by the same method as in Example 1 was 415 nm, and the width of the convex portion of the replica B-9 was 69 nm. Furthermore, the same method as the above-mentioned "evaluation of repetitive usability as a replica in a different material" was used to evaluate the reusability. In either of the copy mold A-9 and the copy mold B-9, on the surface of the copy mold after the first use, adhesion of the residue of the second photocurable composition was not observed in SEM observation. However, cracks occurred in the wire, and after 10 times of use, the wire was broken in many places. Furthermore, the repeatability was evaluated by the same method as the above-mentioned "Evaluation of Repeatability as a Copy Model in the Same Material". After using either copy mold A-9 or copy mold B-9, no residue adhesion of the photocurable composition (9) was observed, but the thread was cracked. After 10 times of use, the thread Fractured at multiple locations.

[比較例3]光硬化性組成物(10)的製備等 製備實施例1中所記載的光硬化性組成物(1)中的不含作為添加劑的X-22-2000(信越矽酮(silicone)公司製造)的組成物,繼而,與實施例1同樣地進行過濾。藉此,製備光硬化性組成物(10)。 使用所獲得的光硬化性組成物(10),依據評價方法1及評價方法2,製作利用LED光源進行了硬化的樹脂膜並加以評價。表面自由能為41.3 mJ/m2 ,硬度為0.27 GPa。 另外,利用與實施例1相同的方法所製作的複製模A-10的凸部寬度為425 nm,複製模B-10的凸部寬度為71 nm。 進而,利用與所述「作為複製模於非同種材料中的重覆使用性的評價」相同的方法來評價重覆使用性。複製模A-10及複製模B-10的任一者均於使用3次後,以目視可知的程度附著有第二光硬化性組成物的殘渣。另外,SEM觀察的結果是以填埋線與線之間的形式附著有第二光硬化性組成物的殘渣。 進而,利用與所述「作為複製模於同種材料中的重覆使用性的評價」相同的方法來評價重覆使用性。使複製模A-10或複製模B-10與光硬化性組成物(10)接觸並進行UV照射硬化後,雖嘗試剝離,但強烈地密接而無法剝離。即,無法於同種材料中重覆使用。[Comparative Example 3] Preparation of photocurable composition (10), etc. The photocurable composition (1) described in Preparation Example 1 does not contain X-22-2000 as an additive (Shin-Etsu Silicone (silicone) ) The composition made by the company) was then filtered in the same manner as in Example 1. In this way, the photocurable composition (10) was prepared. Using the obtained photocurable composition (10), according to Evaluation Method 1 and Evaluation Method 2, a resin film cured with an LED light source was produced and evaluated. The surface free energy is 41.3 mJ/m 2 and the hardness is 0.27 GPa. In addition, the width of the convex portion of the replica A-10 produced by the same method as in Example 1 was 425 nm, and the width of the convex portion of the replica B-10 was 71 nm. Furthermore, the same method as the above-mentioned "evaluation of repetitive usability as a replica in a different material" was used to evaluate the reusability. After using either copy mold A-10 and copy mold B-10 three times, the residue of the second photocurable composition adhered visually. In addition, the result of SEM observation was that the residue of the second photocurable composition adhered between the buried wire and the wire. Furthermore, the repeatability was evaluated by the same method as the above-mentioned "Evaluation of Repeatability as a Copy Model in the Same Material". After the copy mold A-10 or the copy mold B-10 was brought into contact with the photocurable composition (10) and cured by UV irradiation, peeling was attempted, but it adhered strongly and could not be peeled. That is, it cannot be used repeatedly in the same material.

將光硬化性組成物的組成資訊(調配成分)、表面自由能及硬度、作為複製模的重覆使用性的評價結果等匯總示於表1及表2中。The composition information (blended components), surface free energy and hardness of the photocurable composition, evaluation results of reusability as a replica mold, etc. are summarized in Table 1 and Table 2.

[表1] 表1   光硬化性組成物的成分 光硬化後樹脂的物性值 表面自由能 硬度 實施例 光硬化性組成物 光硬化性單體(A) 黏合劑樹脂(B) 添加劑(C) 光硬化起始劑(D) 其他添加劑 mJ/m2 GPa 實施例1 (1) 雙(3-乙基-3-氧雜環丁基甲基)醚與3,4-環氧基環己基甲基-3',4'-環氧基環己烷羧酸酯的質量比7/3的混合物 X-22-2000 CPI-310B 26.2 0.28 實施例2 (2) 雙(3-乙基-3-氧雜環丁基甲基)醚與3,4-環氧基環己基甲基-3',4'-環氧基環己烷羧酸酯的質量比7/3的混合物 聚合物(C-1) CPI-310B 32.0 0.22 實施例3 (3) 雙(3-乙基-3-氧雜環丁基甲基)醚與3,4-環氧基環己基甲基-3',4'-環氧基環己烷羧酸酯的質量比7/3的混合物 X-22-2000/聚合物(C-1) CPI-310B 36.8 0.25 實施例4 (4) 檸檬烯二氧化物 BY16-876/聚合物(C-1) CPI-310B 昂特拉固(Anthracure)UVS-1331(增感劑) 33.2 0.24 實施例5 (5) 雙(3-乙基-3-氧雜環丁基甲基)醚與3,4-環氧基環己基甲基-3',4'-環氧基環己烷羧酸酯的質量比7/3 黏合劑樹脂(B-1) X-22-2000 CPI-310B 34.2 0.23 實施例6 (6) 雙(3-乙基-3-氧雜環丁基甲基)醚與3,4-環氧基環己基甲基-3',4'-環氧基環己烷羧酸酯的質量比7/3的混合物 聚合物(C-2) CPI-310B 28.5 0.25 實施例7 (7) 雙(3-乙基-3-氧雜環丁基甲基)醚與3,4-環氧基環己基甲基-3',4'-環氧基環己烷羧酸酯的質量比7/3的混合物 FM-DA11/聚合物(C-1) CPI-310B 25.7 0.27 比較例1 (8) 甲基丙烯酸甲酯 豔佳固(Irgacure)184 42.7 0.35 比較例2 (9) 季戊四醇三丙烯酸酯/丙烯酸酯聚合物的質量比4/1 豔佳固(Irgacure)184 乙酸甲酯與MEK 37.7 0.83 比較例3 (10) 雙(3-乙基-3-氧雜環丁基甲基)醚與3,4-環氧基環己基甲基-3',4'-環氧基環己烷羧酸酯的質量比7/3的混合物 CPI-310B 41.3 0.27 [Table 1] Table 1 Composition of light-curable composition Physical property value of resin after light curing Surface free energy hardness Example Light-curable composition Light-curing monomer (A) Adhesive resin (B) Additive (C) Light hardening initiator (D) Other additives mJ/m 2 GPa Example 1 (1) The mass ratio of bis(3-ethyl-3-oxetanylmethyl) ether to 3,4-epoxycyclohexylmethyl-3',4'-epoxycyclohexane carboxylate is 7/3 mixture no X-22-2000 CPI-310B no 26.2 0.28 Example 2 (2) The mass ratio of bis(3-ethyl-3-oxetanylmethyl) ether to 3,4-epoxycyclohexylmethyl-3',4'-epoxycyclohexane carboxylate is 7/3 mixture no Polymer (C-1) CPI-310B no 32.0 0.22 Example 3 (3) The mass ratio of bis(3-ethyl-3-oxetanylmethyl) ether to 3,4-epoxycyclohexylmethyl-3',4'-epoxycyclohexane carboxylate is 7/3 mixture no X-22-2000/Polymer (C-1) CPI-310B no 36.8 0.25 Example 4 (4) Limonene Dioxide no BY16-876/polymer (C-1) CPI-310B Anthracure UVS-1331 (sensitizer) 33.2 0.24 Example 5 (5) The mass ratio of bis(3-ethyl-3-oxetanylmethyl) ether to 3,4-epoxycyclohexylmethyl-3',4'-epoxycyclohexane carboxylate is 7/3 Adhesive resin (B-1) X-22-2000 CPI-310B no 34.2 0.23 Example 6 (6) The mass ratio of bis(3-ethyl-3-oxetanylmethyl) ether to 3,4-epoxycyclohexylmethyl-3',4'-epoxycyclohexane carboxylate is 7/3 mixture no Polymer (C-2) CPI-310B no 28.5 0.25 Example 7 (7) The mass ratio of bis(3-ethyl-3-oxetanylmethyl) ether to 3,4-epoxycyclohexylmethyl-3',4'-epoxycyclohexane carboxylate is 7/3 mixture no FM-DA11/Polymer (C-1) CPI-310B no 25.7 0.27 Comparative example 1 (8) Methyl methacrylate no no Irgacure 184 no 42.7 0.35 Comparative example 2 (9) The mass ratio of pentaerythritol triacrylate/acrylate polymer 4/1 no no Irgacure 184 Methyl acetate and MEK 37.7 0.83 Comparative example 3 (10) The mass ratio of bis(3-ethyl-3-oxetanylmethyl) ether to 3,4-epoxycyclohexylmethyl-3',4'-epoxycyclohexane carboxylate is 7/3 mixture no no CPI-310B no 41.3 0.27

[表2] 表2   重覆使用50次後評價 複製模A 複製模B 實施例 光硬化性組成物 線寬度(nm) <>表示複製模製作時的尺寸。 上段:非同種材料 下段:同種材料 判定 線寬度(nm) <>表示複製模製作時的尺寸。 上段:非同種材料 下段:同種材料 判定 實施例1 (1) 449 <449> 74 <74> 449 <449> 74 <74> 實施例2 (2) 449 <449> 73 <73> 449 <449> 73 <73> 實施例3 (3) 448 <448> 75 <75> 448 <448> 75 <75> 實施例4 (4) 448 <448> 74 <74> 448 <448> 74 <74> 實施例5 (5) 450 <450> 74 <74> 450 <450> 74 <74> 實施例6 (6) 448 <448> 74 <74> 448 <448> 74 <74> 實施例7 (7) 448 <448> 74 <74> 448 <448> 74 <74> 比較例1 (8) 無法測量 (使用1次後樹脂附著) × 無法測量 (使用1次後樹脂附著) × 無法測量 (使用1次後溶解) × 無法測量 (使用1次後溶解) × 比較例2 (9) 使用10次後 線斷裂 (健全部分為415 nm/<415 nm>) × 使用10次後 線斷裂 (健全部分為69 nm/<69 nm>) × 使用10次後 線斷裂 (健全部分為415 nm/<415 nm>) × 使用10次後 線斷裂 (健全部分為415 nm/<415 nm>) × 比較例3 (10) 無法測量 (使用3次後樹脂附著) × 無法測量 (使用3次後樹脂附著) × 無法測量 (使用1次後密接) × 無法測量 (使用1次後密接) × [Table 2] Table 2 Evaluation after repeated use 50 times Copy mode A Copy mode B Example Light-curable composition Line width (nm) <> indicates the size of the copy mold. Upper section: non-identical materials Lower section: same materials determination Line width (nm) <> indicates the size of the copy mold. Upper section: non-identical materials Lower section: same materials determination Example 1 (1) 449 <449> 74 <74> 449 <449> 74 <74> Example 2 (2) 449 <449> 73 <73> 449 <449> 73 <73> Example 3 (3) 448 <448> 75 <75> 448 <448> 75 <75> Example 4 (4) 448 <448> 74 <74> 448 <448> 74 <74> Example 5 (5) 450 <450> 74 <74> 450 <450> 74 <74> Example 6 (6) 448 <448> 74 <74> 448 <448> 74 <74> Example 7 (7) 448 <448> 74 <74> 448 <448> 74 <74> Comparative example 1 (8) Unable to measure (resin adheres after 1 use) X Unable to measure (resin adheres after 1 use) X Unable to measure (dissolve after 1 use) X Unable to measure (dissolve after 1 use) X Comparative example 2 (9) The thread breaks after 10 times of use (the sound part is 415 nm/<415 nm>) X The thread breaks after 10 times of use (the sound part is 69 nm/<69 nm>) X The thread breaks after 10 times of use (the sound part is 415 nm/<415 nm>) X The thread breaks after 10 times of use (the sound part is 415 nm/<415 nm>) X Comparative example 3 (10) Unable to measure (resin adheres after 3 times of use) X Unable to measure (resin adheres after 3 times of use) X Unable to measure (closely connected after 1 use) X Unable to measure (closely connected after 1 use) X

於表2的「判定」一欄中,關於複製品使用後的SEM觀察的結果,將使用50次後複製模A及複製模B的凹凸結構的形狀無變化且線寬度與複製模製作時無變化的情況表述為○(良好),將樹脂附著(無法測量)或有斷裂的情況表述為×(差)。In the "Judgment" column of Table 2, regarding the results of the SEM observation of the replica after use, the shape of the concave-convex structure of the replica A and replica B will not change after 50 times of use, and the line width will not be the same as when the replica was made. The case of change is expressed as ○ (good), and the case of resin adhesion (unmeasurable) or fracture is expressed as × (poor).

根據以上所述,由實施例1的光硬化性組成物製作的複製模的重覆使用性良好。即,使用至少50次時,未觀察到第二光硬化性組成物的殘渣附著於表面,另外,可保持抑制了線的斷裂等複製模的劣化的狀態,可重覆利用。According to the above, the replica mold made from the photocurable composition of Example 1 has good repeatability. That is, when it was used at least 50 times, no residue of the second photocurable composition was observed to adhere to the surface. In addition, it was possible to maintain a state in which deterioration of the replica mold such as thread breakage was suppressed, and it was possible to reuse it.

本申請案主張以2019年7月12日提出申請的日本申請特願2019-129863號為基礎的優先權,將其揭示的全部內容併入本申請案中。This application claims priority based on Japanese Application No. 2019-129863 filed on July 12, 2019, and incorporates all the contents disclosed in this application.

no

圖1是利用飛行時間型二次離子質譜法(Time of Flight Secondary Ion Mass Spectroscopy,TOF-SIMS)對由實施例1中所記載的光硬化性組成物(1)製作的複製模B-1的剖面進行映射而得的結果。Figure 1 is the use of time-of-flight secondary ion mass spectroscopy (Time of Flight Secondary Ion Mass Spectroscopy, TOF-SIMS) of the photocurable composition (1) described in Example 1 of the replica model B-1 The result of mapping the profile.

Claims (9)

一種光硬化性組成物,其用於形成包括基板及樹脂層的凹凸結構體的所述樹脂層,所述樹脂層設置於所述基板上且表面形成有微細凹凸,並且所述光硬化性組成物中, 利用下述評價方法1所測定的表面自由能為15 mJ/m2 ~40 mJ/m2 , 利用下述評價方法2所測定的硬度為0.05 GPa~0.5 GPa; (評價方法1) 首先,將光硬化性組成物塗佈於基板而形成光硬化性膜,照射紫外線而獲得經硬化的硬化膜; 其次,使用接觸角計分別測定水、二碘甲烷及1-溴萘相對於所述硬化膜的接觸角; 然後,根據Kitazaki-Hata的理論來算出表面自由能; (評價方法2) 首先,利用與所述評價方法1相同的方法來獲得硬化膜; 其次,使用奈米壓痕儀,將玻氏壓頭壓抵於所述硬化膜,並根據所檢測出的應力的值來算出硬度。A photocurable composition for forming the resin layer of a concavo-convex structure including a substrate and a resin layer, the resin layer is provided on the substrate and has fine concavities and convexities formed on the surface, and the photocurable composition Among them, the surface free energy measured by the following evaluation method 1 is 15 mJ/m 2 to 40 mJ/m 2 , and the hardness measured by the following evaluation method 2 is 0.05 GPa to 0.5 GPa; (evaluation method 1) First, the photocurable composition is applied to the substrate to form a photocurable film, and ultraviolet rays are irradiated to obtain a cured cured film; secondly, the relative values of water, diiodomethane, and 1-bromonaphthalene are measured using a contact angle meter. The contact angle of the cured film; Then, calculate the surface free energy according to Kitazaki-Hata's theory; (Evaluation method 2) First, use the same method as the evaluation method 1 to obtain the cured film; Second, use nanoindentation The instrument presses the Bosch indenter against the cured film, and calculates the hardness based on the value of the detected stress. 如請求項1所述的光硬化性組成物,其中 所述光硬化性組成物包含(a)光硬化性單體、或光硬化性單體與黏合劑樹脂及(b)具有光反應性官能基的添加劑, 相對於所述(a)光硬化性單體、或光硬化性單體與黏合劑樹脂及所述(b)具有光反應性官能基的添加劑的總量,所述(b)具有光反應性官能基的添加劑的含有率為0.001質量%~10質量%。The photocurable composition according to claim 1, wherein The photocurable composition includes (a) a photocurable monomer, or a photocurable monomer and a binder resin, and (b) an additive having a photoreactive functional group, With respect to the total amount of the (a) photocurable monomer, or the photocurable monomer and the binder resin, and the (b) additive having a photoreactive functional group, the (b) has photoreactivity The content rate of the functional group additive is 0.001% by mass to 10% by mass. 如請求項2所述的光硬化性組成物,其中 所述(b)具有光反應性官能基的添加劑包含由下述通式(1)所表示的添加劑及/或含有由以下通式(2)所表示的結構的添加劑;
Figure 03_image001
通式(1)中, R1 相同或不同地表示選自由氫原子、氟原子、鹵素原子、碳數1~20的烴基、碳數6~20的芳基、碳數6~20的芳烷基、碳數1~20的聚醚基及碳數1~20的氟碳基所組成的群組中的任一原子或基, L1 的至少一個含有選自由環氧基、羥基、胺基、乙烯基醚基、內酯基、丙烯基醚基、烯烴基、氧雜環丁基、乙烯基、丙烯酸酯基、甲醇基及羧基所組成的群組中的光反應性官能基,於L1 並非光反應性官能基的情況下,相同或不同地表示選自所述R1 中的原子或基, n及1-n表示各單元的比率;
Figure 03_image003
通式(2)中, L2 為選自由環氧基、胺基、乙烯基醚基、內酯基、丙烯基醚基、醇基、烯烴基、氧雜環丁基、乙烯基、丙烯酸酯基、甲醇基及羧基所組成的群組中的光反應性官能基, R2 ~R5 中的至少一個為選自由氟、含有氟的碳數1~10的烷基、含有氟的碳數1~10的烷氧基及含有氟的碳數2~10的烷氧基烷基所組成的群組中的含氟的基, 於R2 ~R5 並非含氟的基的情況下,R2 ~R5 為選自由氫、碳數1~10的烷基、碳數1~10的烷氧基及碳數2~10的烷氧基烷基所組成的群組中的有機基, R2 ~R5 可相同亦可不同,另外,R2 ~R5 可相互鍵結而形成環結構, 虛線表示所述部分的鍵可為碳-碳單鍵亦可為碳-碳雙鍵。
The photocurable composition according to claim 2, wherein the (b) additive having a photoreactive functional group contains the additive represented by the following general formula (1) and/or contains the additive represented by the following general formula (2) ) Additives of the indicated structure;
Figure 03_image001
In the general formula (1), R 1 is the same or different and represents selected from a hydrogen atom, a fluorine atom, a halogen atom, a hydrocarbon group having 1 to 20 carbons, an aryl group having 6 to 20 carbons, and an alkane having 6 to 20 carbons. Group, any atom or group in the group consisting of a polyether group with 1 to 20 carbons and a fluorocarbon group with 1 to 20 carbons , at least one of L 1 contains an epoxy group, a hydroxyl group, and an amino group , Vinyl ether group, lactone group, propenyl ether group, alkene group, oxetanyl group, vinyl group, acrylate group, methanol group and carboxyl group consisting of photoreactive functional group, in L 1 is not the case where the photoreactive functional group, the same or different, represent R 1 is selected from the atom or group, n and 1-n represents the ratio of the units;
Figure 03_image003
In the general formula (2), L 2 is selected from epoxy groups, amino groups, vinyl ether groups, lactone groups, propenyl ether groups, alcohol groups, alkene groups, oxetanyl groups, vinyl groups, and acrylate groups. At least one of R 2 to R 5 is selected from the group consisting of fluorine, fluorine-containing alkyl group having 1 to 10 carbon atoms, and fluorine-containing carbon number A fluorine-containing group in the group consisting of 1-10 alkoxy groups and fluorine-containing alkoxyalkyl groups having 2-10 carbon atoms. When R 2 to R 5 are not fluorine-containing groups, R 2 to R 5 are organic groups selected from the group consisting of hydrogen, alkyl groups having 1 to 10 carbons, alkoxy groups having 1 to 10 carbons, and alkoxyalkyl groups having 2 to 10 carbons, R 2 to R 5 may be the same or different. In addition, R 2 to R 5 may be bonded to each other to form a ring structure. The dotted line indicates that the bond of the part may be a carbon-carbon single bond or a carbon-carbon double bond.
如請求項1至請求項3中任一項所述的光硬化性組成物,其包含光硬化起始劑。The photocurable composition according to any one of claims 1 to 3, which contains a photocuring initiator. 如請求項2或請求項3所述的光硬化性組成物,其中 所述光硬化性單體包含具有能夠進行陽離子聚合的開環聚合性基的化合物。The photocurable composition according to Claim 2 or Claim 3, wherein The photocurable monomer includes a compound having a ring-opening polymerizable group capable of undergoing cationic polymerization. 一種凹凸結構體的製造方法,其是使用如請求項1至請求項3中任一項所述的光硬化性組成物來製造凹凸結構體,所述凹凸結構體包括:基板;以及樹脂層,設置於所述基板上且表面形成有微細凹凸,並且所述凹凸結構體的製造方法包括壓接步驟, 所述壓接步驟是將具有微細凹凸圖案的模具壓接於藉由所述光硬化性組成物而設置於所述基板上的光硬化性層,藉此於所述樹脂層的表面形成與所述微細凹凸圖案對應的微細凹凸圖案。A method for manufacturing a concavo-convex structure, which uses the photocurable composition according to any one of claims 1 to 3 to manufacture a concavo-convex structure, the concavo-convex structure comprising: a substrate; and a resin layer, Is provided on the substrate with fine concavities and convexities formed on the surface, and the manufacturing method of the concavo-convex structure includes a crimping step, The crimping step is to crimp a mold with a fine concave-convex pattern to the photo-curable layer provided on the substrate by the photo-curable composition, thereby forming and contacting the surface of the resin layer. The fine concavo-convex pattern corresponding to the fine concavo-convex pattern. 如請求項6所述的凹凸結構體的製造方法,其更包括: 光照射步驟,於所述壓接步驟之後,於壓接所述模具的狀態下照射光,藉此使所述光硬化性層硬化而製成硬化層;以及 剝離步驟,自所述硬化層剝離所述模具。The manufacturing method of the concavo-convex structure according to claim 6, which further includes: A light irradiating step, after the crimping step, irradiating light in a state where the mold is crimped to thereby harden the photocurable layer to form a hardened layer; and In the peeling step, the mold is peeled from the hardened layer. 一種形成微細凹凸圖案的方法,其是重覆使用包括如下樹脂層的基板來形成微細凹凸圖案,所述樹脂層是由如請求項1至請求項3中任一項所述的光硬化性組成物形成且表面形成有微細凹凸。A method of forming a fine concavo-convex pattern, which is to repeatedly use a substrate comprising a resin layer to form the fine concavo-convex pattern, the resin layer being composed of the photocurable composition according to any one of claims 1 to 3 The surface is formed with fine concavities and convexities. 一種凹凸結構體,包括: 基板;以及 樹脂層,設置於所述基板上,且由如請求項1至請求項3中任一項所述的光硬化性組成物形成,並表面形成有微細凹凸。A concave-convex structure body, including: Substrate; and The resin layer is provided on the substrate and is formed of the photocurable composition according to any one of claims 1 to 3, and has fine irregularities formed on the surface.
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