TW202101550A - Work processing sheet - Google Patents

Work processing sheet Download PDF

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Publication number
TW202101550A
TW202101550A TW109108152A TW109108152A TW202101550A TW 202101550 A TW202101550 A TW 202101550A TW 109108152 A TW109108152 A TW 109108152A TW 109108152 A TW109108152 A TW 109108152A TW 202101550 A TW202101550 A TW 202101550A
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sheet
intermediate layer
workpiece
workpiece processing
adhesive layer
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TW109108152A
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Chinese (zh)
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高麗洋佑
森田由希
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日商琳得科股份有限公司
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    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J7/00Adhesives in the form of films or foils
    • C09J7/20Adhesives in the form of films or foils characterised by their carriers
    • C09J7/22Plastics; Metallised plastics
    • C09J7/24Plastics; Metallised plastics based on macromolecular compounds obtained by reactions involving only carbon-to-carbon unsaturated bonds
    • C09J7/241Polyolefin, e.g.rubber
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B27/00Layered products comprising a layer of synthetic resin
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J7/00Adhesives in the form of films or foils
    • C09J7/30Adhesives in the form of films or foils characterised by the adhesive composition
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/6835Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
    • H01L21/6836Wafer tapes, e.g. grinding or dicing support tapes
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J2203/00Applications of adhesives in processes or use of adhesives in the form of films or foils
    • C09J2203/326Applications of adhesives in processes or use of adhesives in the form of films or foils for bonding electronic components such as wafers, chips or semiconductors
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J2301/00Additional features of adhesives in the form of films or foils
    • C09J2301/30Additional features of adhesives in the form of films or foils characterized by the chemical, physicochemical or physical properties of the adhesive or the carrier
    • C09J2301/312Additional features of adhesives in the form of films or foils characterized by the chemical, physicochemical or physical properties of the adhesive or the carrier parameters being the characterizing feature
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J2301/00Additional features of adhesives in the form of films or foils
    • C09J2301/40Additional features of adhesives in the form of films or foils characterized by the presence of essential components
    • C09J2301/416Additional features of adhesives in the form of films or foils characterized by the presence of essential components use of irradiation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2221/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
    • H01L2221/67Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
    • H01L2221/683Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L2221/68304Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
    • H01L2221/68327Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support used during dicing or grinding

Abstract

A work processing sheet for processing a work having an uneven structure on a surface, the sheet comprising a base material, an intermediate layer laminated on one surface side of the base material, and a pressure-sensitive adhesive layer laminated on the surface side of the intermediate layer opposite to the base material, wherein the intermediate layer has a storage elastic modulus at 25 DEG C lower than that of the pressure-sensitive adhesive layer at 25 DEG C, the intermediate layer has a thickness of 50-300 [mu]m (inclusive), and the work processing sheet has a bending resistance of 70 mm or less as measured by a cantilever method according to JIS L 1086:2007. Such a work processing sheet has an excellent embedding property and can suppress the generation of wrinkles during sticking.

Description

工件加工用片材Sheets for workpiece processing

本發明是關於一種適合使用在半導體晶圓等的工件的加工的工件加工用片材,特別是關於適合使用於在表面具備凹凸構造的工件的加工的工件加工用片材。The present invention relates to a workpiece processing sheet suitable for use in the processing of workpieces such as semiconductor wafers, and particularly relates to a workpiece processing sheet suitable for use in the processing of a workpiece having an uneven structure on the surface.

在半導體裝置的製造中,一般而言,在半導體晶圓的表面形成迴路後,對半導體晶圓的背面進行研削加工,進行調整半導體晶圓的厚度的背面研削步驟,以及切割半導體晶圓,對晶片進行個片化的切割步驟。In the manufacture of semiconductor devices, generally speaking, after forming a loop on the surface of the semiconductor wafer, the back surface of the semiconductor wafer is ground, the thickness of the semiconductor wafer is adjusted, and the semiconductor wafer is cut. The wafer undergoes a dicing step.

附帶一提,近年,隨著被製造的半導體裝置多樣化,具有特殊的構成、構造的工件件,會成為上述的加工對象。作為此類工件的一例,可使用在表面具備凹凸構造的工件。Incidentally, in recent years, with the diversification of manufactured semiconductor devices, workpieces with special structures and structures have become the aforementioned processing objects. As an example of such a workpiece, a workpiece having an uneven structure on the surface can be used.

例如,對應近年的電子迴路的大容量化、高機能化,將複數個半導體晶片立體地積層的積層迴路的開發獲得進展。在此類積層迴路中,雖然過去一般是將半導體晶片的導電連接藉由引線接合而進行,但由於小型化-高機能化的必要性,因此開發不是進行引線接合,而是製造具有貫通從迴路形成面至其相反面的貫通電極(TSV)的TSV晶片,將上下的TSV晶片間進行直接導電連接的方法作為有效的手法。For example, in response to the increase in capacity and functionality of electronic circuits in recent years, the development of multilayer circuits in which a plurality of semiconductor wafers are stacked three-dimensionally has been progressing. In this type of multilayer circuit, although the conductive connection of the semiconductor wafer is generally performed by wire bonding in the past, due to the necessity of miniaturization and high performance, the development is not wire bonding, but manufacturing with through-slave circuits For TSV wafers that form through electrodes (TSV) from the surface to the opposite surface, direct conductive connection between the upper and lower TSV wafers is an effective technique.

為了實現在上述TSV晶片間直接的導電連接,TSV晶片通常會以貫通電極的端部從晶片的表面突出的方式設置,或是,在貫通電極的端部設置凸狀電極(以下,有時會將貫通電極的突出部分以及設置在貫通電極的端部的凸狀電極,再者在工件件的表面上以突出的方式所設置的電極,總稱為「凸塊」)。此類凸塊為構成晶片表面的凹凸構造者。In order to realize the direct conductive connection between the above-mentioned TSV wafers, TSV wafers are usually provided in such a way that the end of the through electrode protrudes from the surface of the wafer, or the end of the through electrode is provided with a convex electrode (hereinafter, sometimes The protruding part of the through-electrode, the convex electrode provided at the end of the through-electrode, and the electrode provided in a protruding manner on the surface of the workpiece are collectively referred to as "bumps"). Such bumps are those that constitute the uneven structure on the surface of the wafer.

如上述在表面具有凸塊的晶片,可藉由將在表面具有凸塊的晶圓在工件加工用片材上進行切割進而個片化而獲得。在此切割時,從保護凸塊的觀點而言,在晶圓中有凸塊存在的面上貼附工件加工用片材。因此,要求在工件加工用片材中,可將存在於工件件的表面上的凸塊良好地埋入的埋入性。The wafer having bumps on the surface as described above can be obtained by dicing the wafer having bumps on the surface on a workpiece processing sheet and then dividing them into pieces. In this dicing, from the viewpoint of protecting the bumps, a workpiece processing sheet is attached to the surface of the wafer where the bumps exist. Therefore, in the sheet for processing a workpiece, it is required to have good embedding properties that can bury bumps existing on the surface of the workpiece.

例如,在專利文獻1中,揭示假設將如上述具有凸塊的半導體晶圓作為工件件的工件加工用片材。特別是在專利文獻1中,從實現凸塊的良好的埋入性的觀點而言,揭示在基材與黏著劑層間設置吸收層。 [先前技術文獻] [專利文獻]For example, Patent Document 1 discloses a workpiece processing sheet assuming that a semiconductor wafer having bumps as described above is used as a workpiece. In particular, Patent Document 1 discloses that an absorption layer is provided between the base material and the adhesive layer from the viewpoint of achieving good embedment of bumps. [Prior Technical Literature] [Patent Literature]

專利文獻1:日本特許6051302號公報Patent Document 1: Japanese Patent No. 6051302

[發明欲解決的問題][The problem to be solved by the invention]

附帶一提,使用工件加工用片材進行晶圓的切割時,將工件加工用片材的具有黏著性的面(以下,有時稱為「黏著面」)貼附在晶圓以及切割用框架上。過去的工件加工用片材,在此貼附時導致皺褶發生,對於在其後進行的切割步驟、擴展(expanding)步驟產生不良影響。Incidentally, when dicing a wafer using a workpiece processing sheet, the adhesive surface (hereinafter, sometimes referred to as "adhesive surface") of the workpiece processing sheet is attached to the wafer and the dicing frame on. The conventional sheet material for workpiece processing causes wrinkles when attached here, which adversely affects the cutting step and the expanding step performed thereafter.

本發明為鑒於上述情形而完成者,其目的為提供一種具有優良的埋入性,同時能抑制在貼附時的皺褶的發生的工件加工用片材。 [解決問題的手段]The present invention was made in view of the above circumstances, and its object is to provide a sheet for workpiece processing that has excellent embedding properties while suppressing the occurrence of wrinkles at the time of attachment. [Means to solve the problem]

為了達成上述目的,第一,本發明提供一種工件加工用片材,具備:基材、積層在上述基材的單面側的中間層,以及積層在上述中間層中與上述基材相反的面側的黏著劑層,用以在表面具備凹凸構造的工件件進行加工,為上述中間層在25℃的貯藏模數比上述黏著劑層在25℃的貯藏模數更低,上述中間層的厚度為50μm以上,300μm以下,藉由以JIS L1086:2007為基準的懸臂法所測定的上述工件加工用片材的抗彎曲性為70mm以下的工件加工用片材(發明1)。In order to achieve the above-mentioned object, first, the present invention provides a work-processing sheet comprising: a base material, an intermediate layer laminated on one side of the base material, and the intermediate layer laminated on the opposite side of the base material The adhesive layer on the side is used for processing workpieces with uneven structure on the surface. The storage modulus of the intermediate layer at 25°C is lower than that of the adhesive layer at 25°C. The thickness of the intermediate layer It is 50 μm or more and 300 μm or less, and the bending resistance of the above-mentioned workpiece processing sheet measured by the cantilever method based on JIS L1086:2007 is 70 mm or less (Invention 1).

上述發明(發明1)相關的工件加工用片材,藉由在基材與黏著劑層之間,具備具有如上述的貯藏模數以及厚度的中間層,對於存在於工件件的表面的凹凸構造,能夠發揮優良的埋入性。再者,藉由工件加工用片材的抗彎曲性於上述範圍,可良好地抑制在貼附時的皺褶的發生。The above-mentioned invention (Invention 1) related to the workpiece processing sheet, by providing an intermediate layer having the above-mentioned storage modulus and thickness between the base material and the adhesive layer, the uneven structure existing on the surface of the workpiece , Can exert excellent embedding. Furthermore, since the bending resistance of the work-processing sheet is within the above-mentioned range, the occurrence of wrinkles at the time of sticking can be well suppressed.

在上述發明(發明1)中,以上述中間層在25℃的貯藏模數比上述黏著劑層在25℃的貯藏模數低20kPa以上為佳(發明2)。In the above invention (Invention 1), the storage modulus of the intermediate layer at 25°C is preferably 20 kPa or more lower than the storage modulus of the adhesive layer at 25°C (Invention 2).

在上述發明(發明1、2)中,上述中間層在25℃的貯藏模數以10kPa以上,260kPa以下為佳(發明3)。In the above inventions (Inventions 1 and 2), the storage modulus of the intermediate layer at 25°C is preferably 10 kPa or more and 260 kPa or less (Invention 3).

在上述發明(發明1~3)中,上述黏著劑層在25℃的貯藏模數以50kPa以上,300kPa以下為佳(發明4)。In the above inventions (Inventions 1 to 3), the storage modulus of the adhesive layer at 25°C is preferably 50 kPa or more and 300 kPa or less (Invention 4).

在上述發明(發明1~4)中,上述基材以由聚烯烴系膜所構成為佳(發明5)。In the above inventions (Inventions 1 to 4), the above-mentioned substrate is preferably composed of a polyolefin-based film (Invention 5).

在上述發明(發明1~5)中,上述黏著劑層以由活性能量射線硬化性黏著劑所構成為佳(發明6)。In the above inventions (Inventions 1 to 5), the adhesive layer is preferably composed of an active energy ray-curable adhesive (Invention 6).

在上述發明(發明1~6)中,上述工件以在表面具有凸塊的工件為佳(發明7)。In the aforementioned inventions (Inventions 1 to 6), the aforementioned workpiece is preferably a workpiece having bumps on the surface (Invention 7).

在上述發明(發明7)中,上述凸塊的高度以50μm以上為佳(發明8)。 [發明的效果]In the above invention (Invention 7), the height of the bump is preferably 50 μm or more (Invention 8). [Effects of the invention]

本發明相關的工件加工用片材具有優良的埋入性,同時可抑制貼附時的皺褶的發生。The sheet for workpiece processing according to the present invention has excellent embedding properties and can suppress the occurrence of wrinkles during attachment.

以下,說明有關於本發明的實施形態。 圖1為本發明一實施形態相關的工件加工用片材的剖面圖。本實施形態相關的工件加工用片材1,具備:基材11、積層在單面側的中間層12,以及積層在中間層12中與基材11相反的面側的黏著劑層13。Hereinafter, embodiments related to the present invention will be described. Fig. 1 is a cross-sectional view of a sheet for workpiece processing according to an embodiment of the present invention. The work processing sheet 1 according to this embodiment includes a base material 11, an intermediate layer 12 laminated on one side, and an adhesive layer 13 laminated on the side of the intermediate layer 12 opposite to the base material 11.

1.工件加工用片材的構成構件 (1)基材 作為在本實施形態中的基材11,只要是可實現關於工件加工用片材1的抗彎曲性的上述條件,同時發揮在使用工件加工用片材1時所期望的機能者,則無特別限定。1. Constituents of sheets for workpiece processing (1) Substrate As the base material 11 in the present embodiment, there is nothing in particular as long as it can achieve the above-mentioned conditions regarding the bending resistance of the workpiece processing sheet 1 and at the same time exhibit the desired functions when the workpiece processing sheet 1 is used. limited.

特別是,基材11以樹脂系的材料作為主材料的樹脂模為佳。作為其具體例,可列舉,聚乙烯膜、聚丙烯膜、聚丁烯膜、聚丁二烯膜、聚甲基戊烯膜、乙烯-降莰烯共聚物膜、降莰烯樹脂膜等的聚烯烴系膜;聚對苯二甲酸乙二酯膜、聚對苯二甲酸丁二酯膜、聚萘二甲酸乙二酯等的聚酯系膜;乙烯-醋酸乙烯酯共聚物膜;乙烯-(甲基)丙烯酸共聚物膜、乙烯-(甲基)丙烯酸甲酯共聚物膜、其他的乙烯-(甲基)丙烯酸酯共聚物膜等的乙烯系共聚膜;聚氯乙烯膜、氯乙烯共聚物膜等的聚氯乙烯系膜;(甲基)丙烯酸酯共聚物膜;聚氨酯膜;聚醯亞胺膜;聚苯乙烯膜;聚碳酸酯膜;氟樹脂膜等。此外,亦可使用其等的交聯膜、離子性聚合物膜之類的改質膜。此外,基材11亦可是由上述的膜積層複數層而構成的積層膜。在此積層膜中,構成各層的材料可相同,亦可相異。且,在本說明書中,「(甲基)丙烯酸」是指丙烯酸以及甲基丙烯酸兩者的意思。關於其他類似用語亦相同。In particular, the base material 11 is preferably a resin mold whose main material is a resin-based material. Specific examples thereof include polyethylene film, polypropylene film, polybutene film, polybutadiene film, polymethylpentene film, ethylene-norbornene copolymer film, norbornene resin film, etc. Polyolefin-based film; polyester-based film such as polyethylene terephthalate film, polybutylene terephthalate film, and polyethylene naphthalate; ethylene-vinyl acetate copolymer film; ethylene- (Meth)acrylic acid copolymer film, ethylene-methyl (meth)acrylate copolymer film, other ethylene-(meth)acrylate copolymer film and other ethylene-based copolymer films; polyvinyl chloride film, vinyl chloride copolymer Polyvinyl chloride-based films such as material films; (meth)acrylate copolymer films; polyurethane films; polyimide films; polystyrene films; polycarbonate films; fluororesin films, etc. In addition, modified membranes such as cross-linked membranes and ionic polymer membranes can also be used. In addition, the base material 11 may be a laminated film formed by laminating a plurality of layers of the above-mentioned films. In this laminated film, the materials constituting each layer may be the same or different. In addition, in this specification, "(meth)acrylic acid" means both acrylic acid and methacrylic acid. The same applies to other similar terms.

作為本實施形態中的基材11,從易於滿足工件加工用片材1的抗彎曲性的條件的觀點而言,上述的膜當中,以聚烯烴系膜為佳,特別是以聚乙烯膜為佳。作為聚乙烯膜的較佳例,可列舉,低密度聚乙烯(LDPE)膜、直鏈低密度聚乙烯(LLDPE)膜、高密度聚乙烯(HDPE)膜等。As the base material 11 in this embodiment, from the viewpoint of easily satisfying the requirements of the bending resistance of the workpiece processing sheet 1, among the above-mentioned films, a polyolefin-based film is preferred, and a polyethylene film is particularly preferred. good. As a preferable example of a polyethylene film, a low density polyethylene (LDPE) film, a linear low density polyethylene (LLDPE) film, a high density polyethylene (HDPE) film, etc. are mentioned.

基材11亦可含有阻燃劑、塑化劑、抗靜電劑、潤滑劑、抗氧化劑、著色劑、紅外線吸收劑、紫外線吸收劑、紫外線吸收劑等的各種添加劑。作為其等添加劑的含量,雖然無特別限定,但以在基材11能發揮期望的機能的範圍為佳。The base material 11 may also contain various additives such as flame retardants, plasticizers, antistatic agents, lubricants, antioxidants, colorants, infrared absorbers, ultraviolet absorbers, and ultraviolet absorbers. Although the content of these additives is not particularly limited, it is preferably a range in which the substrate 11 can exhibit desired functions.

在基材11的積層有中間層12的面上,為了提高與中間層12的密著性,亦可實施底塗處理、電暈處理、電漿處理等的表面處理。On the surface of the base material 11 on which the intermediate layer 12 is laminated, in order to improve the adhesion with the intermediate layer 12, surface treatments such as primer treatment, corona treatment, and plasma treatment may be performed.

雖然基材11的厚度只要對應使用工件加工用片材1的方法而適當選擇即可,但從易於滿足工件加工用片材1的抗彎曲性的條件的觀點而言,以200μm以下為佳,特別是以150μm以下為佳。此外,基材11的厚度,從工件加工用片材1易於具有可承受工件的加工的強度的觀點而言,以10μm以上為佳,特別是以25μm以上為佳。Although the thickness of the base material 11 may be appropriately selected according to the method of using the workpiece processing sheet 1, from the viewpoint of easily satisfying the bending resistance condition of the workpiece processing sheet 1, it is preferably 200 μm or less. In particular, it is preferably 150 μm or less. In addition, the thickness of the base material 11 is preferably 10 μm or more, and particularly preferably 25 μm or more, from the viewpoint that the workpiece processing sheet 1 easily has a strength that can withstand the processing of the workpiece.

(2)黏著劑層 作為構成本實施形態中的黏著劑層13的黏著劑,只要是能夠實現中間層12與黏著劑層13之間的貯藏模數的關係,同時對於工件的加工能發揮充分的對工件的黏著力即可,並無特別限定。(2) Adhesive layer As the adhesive constituting the adhesive layer 13 in this embodiment, as long as it can realize the storage modulus relationship between the intermediate layer 12 and the adhesive layer 13, and at the same time, it can exert sufficient adhesion to the workpiece for the processing of the workpiece. That is, it is not particularly limited.

例如,作為構成黏著劑層13的黏著劑的例子,可列舉,丙烯酸系黏著劑、橡膠系黏著劑、矽酮系黏著劑、氨酯系黏著劑、聚酯系黏著劑、聚乙烯醚系黏著劑等。此等當中,從容易發揮期望的黏著力,又,易於調整黏著劑層13的貯藏模數的觀點而言,以使用丙烯酸系黏著劑為佳。For example, as examples of adhesives constituting the adhesive layer 13, acrylic adhesives, rubber-based adhesives, silicone-based adhesives, urethane-based adhesives, polyester-based adhesives, and polyvinyl ether-based adhesives can be cited.剂 etc. Among these, it is preferable to use an acrylic adhesive from the viewpoint that it is easy to exert a desired adhesive force and to adjust the storage modulus of the adhesive layer 13 easily.

此外,構成黏著劑層13的黏著劑,雖然可以是不具有活性能量射線硬化性的黏著劑,但以具有活性能量射線硬化性的黏著劑(以下,有時稱為「活性能量射線硬化性黏著劑」)為佳。藉由黏著劑層13為由活性能量射線硬化性黏著劑所構成,藉由活性能量射線的照射使黏著劑層13硬化,可降低工件加工用片材1對被附著物的黏著力。如此一來,加工後的工件變得容易從工件加工用片材1分離。In addition, although the adhesive constituting the adhesive layer 13 may be an adhesive that does not have active energy ray hardening properties, it may be an adhesive having active energy ray hardening properties (hereinafter, sometimes referred to as "active energy ray hardening adhesive Agent ") is better. Since the adhesive layer 13 is composed of an active energy ray-curable adhesive, the adhesive layer 13 is hardened by irradiation of the active energy ray, so that the adhesive force of the workpiece processing sheet 1 to the adherend can be reduced. In this way, the processed workpiece becomes easy to separate from the workpiece processing sheet 1.

作為構成黏著劑層13的活性能量射線硬化性黏著劑,可以是以具有活性能量射線硬化性的聚合物作為主成分者,也可以是活性能量射線非硬化性聚合物(不具有活性能量射線硬化性的聚合物)與具有至少1個以上的活性能量射線硬化性基的單體及/或寡聚物的混合物作為主成分者。The active energy ray curable adhesive constituting the adhesive layer 13 may be a polymer having active energy ray curability as the main component, or an active energy ray non-curable polymer (without active energy ray curable (A polymer) and a mixture of monomers and/or oligomers having at least one active energy ray-curable group as the main component.

首先,活性能量射線硬化性黏著劑為以具有活性能量射線硬化性的聚合物作為主成分的情形,以下進行說明。First, the active energy ray-curable adhesive is a case where a polymer having active energy ray-curable properties is used as a main component, which will be described below.

具有活性能量射線硬化性的聚合物,以在側鏈導入具有活性能量射線硬化性的官能基(活性能量射線硬化性基)的(甲基)丙烯酸酯(共)聚合物(A)(以下,有時稱為「活性能量射線硬化性聚合物(A)」)為佳。藉由使用該活性能量射線硬化性聚合物(A),在使黏著劑層13硬化後的工件加工用片材1與被附著物分離時,變得易於控制對被附著物的殘膠。此活性能量射線硬化性聚合物(A)以使具有含官能基的單體的單元的丙烯酸系共聚物(a1)與具有鍵結在該官能基的官能基的含不飽和基的化合物(a2)反應而獲得者為佳。A polymer having active energy ray-curable properties, in which a (meth)acrylate (co)polymer (A) having active energy ray-curable functional groups (active energy ray-curable groups) introduced into the side chain (hereinafter, It is sometimes referred to as "active energy ray-curable polymer (A)"). By using this active energy ray-curable polymer (A), when the work processing sheet 1 after the adhesive layer 13 is cured is separated from the adherend, it becomes easy to control the adhesive residue on the adherend. This active energy ray-curable polymer (A) is an acrylic copolymer (a1) having a functional group-containing monomer unit and an unsaturated group-containing compound (a2) having a functional group bonded to the functional group ) The winner is preferred.

作為上述含官能基的單體,以在分子內具有聚合性的雙鍵,與羥基、羧基、胺基、醯胺基、苄基、環氧丙基等的官能基的單體為佳,此等當中,作為官能基,以使用含有羥基的單體(含羥基的單體)為佳。As the above-mentioned functional group-containing monomer, a monomer having a polymerizable double bond in the molecule and a functional group such as a hydroxyl group, a carboxyl group, an amino group, an amido group, a benzyl group, and a glycidyl group is preferable. Among others, as the functional group, it is preferable to use a hydroxyl-containing monomer (a hydroxyl-containing monomer).

作為上述含羥基的單體,可列舉,例如,(甲基)丙烯酸2-羥乙酯、(甲基)丙烯酸2-羥丙酯、(甲基)丙烯酸3-羥丙酯、(甲基)丙烯酸2-羥丁酯、(甲基)丙烯酸3-羥丁酯、(甲基)丙烯酸4-羥丁酯等,此等當中,以使用丙烯酸2-羥乙酯為佳。且,此等可單獨或組合2種以上使用。Examples of the above-mentioned hydroxyl-containing monomers include, for example, 2-hydroxyethyl (meth)acrylate, 2-hydroxypropyl (meth)acrylate, 3-hydroxypropyl (meth)acrylate, and (meth) 2-hydroxybutyl acrylate, 3-hydroxybutyl (meth)acrylate, 4-hydroxybutyl (meth)acrylate, etc. Among these, 2-hydroxyethyl acrylate is preferably used. Moreover, these can be used individually or in combination of 2 or more types.

作為上述含羧基的單體,可列舉,例如,丙烯酸、甲基丙烯酸、丁烯酸、順丁烯二酸、伊康酸、檸康酸等的乙烯性不飽和羧酸。此等可單獨使用,亦可組合2種以上使用。Examples of the carboxyl group-containing monomer include ethylenically unsaturated carboxylic acids such as acrylic acid, methacrylic acid, crotonic acid, maleic acid, itaconic acid, and citraconic acid. These can be used alone or in combination of two or more kinds.

作為上述含胺基的單體或含醯胺基的單體,可列舉,例如,(甲基)丙烯酸胺基乙酯、(甲基)丙烯酸正丁基胺基乙酯等。此等可單獨使用,亦可組合2種以上使用。Examples of the above-mentioned amine group-containing monomers or amide group-containing monomers include, for example, aminoethyl (meth)acrylate, n-butylaminoethyl (meth)acrylate, and the like. These can be used alone or in combination of two or more kinds.

丙烯酸系共聚物(a1),以含有3質量%以上的從上述含官能基的單體導出的構成單元為佳,特別是以含有5質量%以上為佳。此外,丙烯酸系共聚物(a1),以含有30質量%以下的從上述含官能基的單體導出的構成單元為佳,特別是以含有20質量%以下為佳,進一步以含有15質量%以下為佳。丙烯酸系共聚物(a1)藉由含有上述範圍的含官能基的單體,變得容易形成期望的活性能量射線硬化性聚合物(A)。The acrylic copolymer (a1) preferably contains 3% by mass or more of the structural unit derived from the above-mentioned functional group-containing monomer, and particularly preferably contains 5% by mass or more. In addition, the acrylic copolymer (a1) preferably contains 30% by mass or less of the structural units derived from the above-mentioned functional group-containing monomer, particularly preferably 20% by mass or less, and further preferably contains 15% by mass or less Better. When the acrylic copolymer (a1) contains the functional group-containing monomer in the above range, it becomes easy to form the desired active energy ray-curable polymer (A).

丙烯酸系共聚物(a1),從易於形成具有期望的性能的黏著劑的觀點而言,作為構成丙烯酸系共聚物(a1)的單體單元,以含有(甲基)丙烯酸烷基酯為佳。作為該(甲基)丙烯酸烷基酯,以烷基的碳數為1~18者為佳,特別是以碳數為1~4者為佳。The acrylic copolymer (a1) preferably contains an alkyl (meth)acrylate as a monomer unit constituting the acrylic copolymer (a1) from the viewpoint of easy formation of an adhesive having desired performance. As the alkyl (meth)acrylate, those having 1 to 18 carbon atoms in the alkyl group are preferred, and those having 1 to 4 carbon atoms are particularly preferred.

作為上述(甲基)丙烯酸烷基酯的具體例,可列舉,(甲基)丙烯酸甲酯、(甲基)丙烯酸乙酯、(甲基)丙烯酸丙酯、(甲基)丙烯酸正丁酯、(甲基)丙烯酸正戊酯、(甲基)丙烯酸正己酯、(甲基)丙烯酸2-乙基己酯、(甲基)丙烯酸異辛酯、(甲基)丙烯酸正癸酯、(甲基)丙烯酸月桂酯、(甲基)丙烯酸肉豆蔻酯、(甲基)丙烯酸棕櫚酯、(甲基)丙烯酸硬脂醯酯等。此等可單獨使用,亦可組合2種以上使用。上述的(甲基)丙烯酸烷基酯當中,以使用(甲基)丙烯酸甲酯以及(甲基)丙烯酸正丁酯的至少1種為佳,特別是以使用丙烯酸甲酯以及丙烯酸正丁酯的至少1種為佳。As specific examples of the aforementioned alkyl (meth)acrylate, methyl (meth)acrylate, ethyl (meth)acrylate, propyl (meth)acrylate, n-butyl (meth)acrylate, N-pentyl (meth)acrylate, n-hexyl (meth)acrylate, 2-ethylhexyl (meth)acrylate, isooctyl (meth)acrylate, n-decyl (meth)acrylate, (meth) ) Lauryl acrylate, myristyl (meth)acrylate, palmityl (meth)acrylate, stearyl (meth)acrylate, etc. These can be used alone or in combination of two or more kinds. Among the above alkyl (meth)acrylates, it is preferable to use at least one of methyl (meth)acrylate and n-butyl (meth)acrylate, especially those using methyl acrylate and n-butyl acrylate At least one is preferred.

丙烯酸系共聚物(a1),以含有60質量%以上的從上述(甲基)丙烯酸烷基酯導出的為佳,特別是以含有70質量%以上為佳,進一步以含有80質量%以上為佳。此外,丙烯酸系共聚物(a1),以含有97質量%以下的從上述(甲基)丙烯酸烷基酯導出的為佳,特別是以含有95質量%以下為佳,進一步以含有85質量%以下為佳。丙烯酸系共聚物(a1)藉由含有上述範圍的(甲基)丙烯酸烷基酯,變得易於形成具有期望的性能的黏著劑。The acrylic copolymer (a1) preferably contains 60% by mass or more derived from the above alkyl (meth)acrylate, especially 70% by mass or more, and more preferably 80% by mass or more . In addition, the acrylic copolymer (a1) preferably contains 97% by mass or less derived from the above alkyl (meth)acrylate, particularly preferably 95% by mass or less, and further preferably contains 85% by mass or less Better. When the acrylic copolymer (a1) contains the alkyl (meth)acrylate in the above range, it becomes easy to form an adhesive having desired performance.

丙烯酸系共聚物(a1),連同上述含官能基的單體以及(甲基)丙烯酸烷基酯,亦可為將其他單體進行共聚合者。Acrylic copolymer (a1), together with the above-mentioned functional group-containing monomer and alkyl (meth)acrylate, may be copolymerized with other monomers.

作為上述其他的單體,可列舉,例如,(甲基)丙烯酸甲氧基甲酯、(甲基)丙烯酸甲氧基乙酯、(甲基)丙烯酸乙氧基甲酯、(甲基)丙烯酸乙氧基乙酯等的含烷氧基烷基的(甲基)丙烯酸酯;(甲基)丙烯酸環己酯等的具有脂肪族環的(甲基)丙烯酸酯;(甲基)丙烯酸苯酯等的具有芳香族環的(甲基)丙烯酸酯;N-(甲基)丙烯醯基嗎福啉、N-乙烯基-2-吡咯烷酮、N-(甲基)丙烯醯基吡咯烷酮等的具有含氮雜環的單體;(甲基)丙烯醯胺、N,N-二甲基(甲基)丙烯醯胺等的非交聯性的丙烯醯胺;(甲基)丙烯酸N,N-二甲基胺基乙酯、(甲基)丙烯酸N,N-二甲基胺基丙酯等的非交聯性的具有3級胺基的(甲基)丙烯酸酯;醋酸乙烯酯;苯乙烯等。Examples of the above-mentioned other monomers include, for example, methoxymethyl (meth)acrylate, methoxyethyl (meth)acrylate, ethoxymethyl (meth)acrylate, and (meth)acrylic acid. Alkoxyalkyl-containing (meth)acrylates such as ethoxyethyl; (meth)acrylates having aliphatic rings such as cyclohexyl (meth)acrylate; phenyl (meth)acrylates (Meth)acrylates with aromatic rings; N-(meth)acryloylmorpholine, N-vinyl-2-pyrrolidone, N-(meth)acryloylpyrrolidone, etc. Nitrogen heterocyclic monomers; (meth)acrylamide, N,N-dimethyl (meth)acrylamide and other non-crosslinkable acrylamide; (meth)acrylic acid N,N-di Non-crosslinkable (meth)acrylates with tertiary amino groups such as methylaminoethyl and N,N-dimethylaminopropyl (meth)acrylate; vinyl acetate; styrene, etc. .

丙烯酸系共聚物(a1)的聚合態樣,可以是隨機共聚物,也可以是嵌段共聚物。此外,關於聚合法並無特別,可藉由一般的聚合法,例如,溶液聚合法進行聚合。The polymerization state of the acrylic copolymer (a1) may be a random copolymer or a block copolymer. In addition, there is nothing special about the polymerization method, and the polymerization can be carried out by a general polymerization method, for example, a solution polymerization method.

藉由使上述具有含官能基的單體的單元的丙烯酸系共聚物(a1),與具有鍵結在其官能基的官能基的含不飽和基的化合物(a2)反應,可獲得活性能量射線硬化性聚合物(A)。By reacting the above-mentioned acrylic copolymer (a1) having a functional group-containing monomer unit with an unsaturated group-containing compound (a2) having a functional group bonded to the functional group, active energy rays can be obtained Curing polymer (A).

含不飽和基的化合物(a2)所具有的官能基,可對應丙烯酸系共聚物(a1)所具有的含官能基的單體的單元的官能基的種類,而適當選擇。例如,丙烯酸系共聚物(a1)具有的官能基為羥基、胺基或醯胺基時,作為含不飽和基的化合物(a2)所具有的官能基,以異氰酸酯基或環氧基為佳,丙烯酸系共聚物(a1)具有的官能基為環氧丙基時,作為含不飽和基的化合物(a2)所具有的官能基,以胺基、羧基或氮丙啶基為佳。The functional group of the unsaturated group-containing compound (a2) can be appropriately selected according to the type of the functional group of the functional group-containing monomer unit of the acrylic copolymer (a1). For example, when the functional group of the acrylic copolymer (a1) is a hydroxyl group, an amino group, or an amide group, the functional group of the unsaturated group-containing compound (a2) is preferably an isocyanate group or an epoxy group. When the functional group of the acrylic copolymer (a1) is a glycidyl group, the functional group of the unsaturated group-containing compound (a2) is preferably an amino group, a carboxyl group, or an aziridin group.

此外,上述含不飽和基的化合物(a2)中,活性能量射線聚合性的碳-碳雙鍵,1分子中含有至少1個,以1~6個為佳,進一步以1~4個為佳。作為此類含不飽和基的化合物(a2)的具體例,可列舉,例如,2-甲基丙烯醯基氧基乙基異氰酸酯、間-異丙烯基-α,α-二甲基苄基異氰酸酯、甲基丙烯醯基異氰酸酯、烯丙基異氰酸酯、1,1-(雙丙烯醯基氧基甲基)乙基異氰酸酯;藉由二異氰酸酯化合物或聚異氰酸酯化合物,與(甲基)丙烯酸羥乙酯反應可獲得的丙烯醯基單異氰酸酯化合物;藉由二異氰酸酯化合物或聚異氰酸酯化合物,與聚醇化合物,與(甲基)丙烯酸羥乙酯反應可獲得的丙烯醯基單異氰酸酯化合物;(甲基)丙烯酸環氧丙酯;(甲基)丙烯酸、(甲基)丙烯酸2-(1-氮丙啶基)乙酯、2-乙烯基-2-㗁唑啉、2-異丙烯基-2-㗁唑啉等。In addition, in the above-mentioned unsaturated group-containing compound (a2), the active energy ray-polymerizable carbon-carbon double bond contains at least one per molecule, preferably 1 to 6, and more preferably 1 to 4 . As specific examples of the unsaturated group-containing compound (a2), for example, 2-methacryloyloxyethyl isocyanate, m-isopropenyl-α,α-dimethylbenzyl isocyanate , Methacrylic isocyanate, allyl isocyanate, 1,1-(bisacryloxymethyl) ethyl isocyanate; by diisocyanate compound or polyisocyanate compound, and (meth) hydroxyethyl acrylate Acrylic monoisocyanate compound obtainable by reaction; Acrylic monoisocyanate compound obtained by reacting diisocyanate compound or polyisocyanate compound with polyol compound and hydroxyethyl (meth)acrylate; (methyl) Glycidyl acrylate; (meth)acrylic acid, 2-(1-aziridinyl)ethyl (meth)acrylate, 2-vinyl-2-oxazoline, 2-isopropenyl-2-㗁Oxazoline etc.

上述含不飽和基的化合物(a2),相對於上述丙烯酸系共聚物(a1)的含官能基的單體的莫耳數,可以使用50莫耳%以上的比例為佳,特別是以60莫耳%以上為佳,進一步以70莫耳%以上為佳。此外,上述含不飽和基的化合物(a2),相對於上述丙烯酸系共聚物(a1)的含官能基的單體的莫耳數,以使用95莫耳%以下的比例為佳,特別是以93莫耳%以下為佳,進一步以90莫耳%以下為佳。The unsaturated group-containing compound (a2) may be used in a ratio of 50 mol% or more relative to the number of moles of the functional group-containing monomer of the acrylic copolymer (a1), especially 60 mol%. More than ear% is preferable, and more than 70 mol% is more preferable. In addition, the above-mentioned unsaturated group-containing compound (a2) is preferably used in a ratio of 95 mol% or less to the number of moles of the functional group-containing monomer of the above-mentioned acrylic copolymer (a1), especially It is preferably 93 mol% or less, and more preferably 90 mol% or less.

在丙烯酸系共聚物(a1)與含不飽和基的化合物(a2)的反應中,對應丙烯酸系共聚物(a1)具有的官能基及含不飽和基的化合物(a2)具有的官能基的組合,可適當選擇反應的溫度、壓力、溶媒、時間、有無觸媒、觸媒的種類。如此一來,丙烯酸系共聚物(a1)中所存在的官能基,與含不飽和基的化合物(a2)中的官能基進行反應,將不飽和基導入丙烯酸系共聚物(a1)中的側鏈,可獲得活性能量射線硬化性聚合物(A)。In the reaction between the acrylic copolymer (a1) and the unsaturated group-containing compound (a2), it corresponds to the combination of the functional group of the acrylic copolymer (a1) and the functional group of the unsaturated group-containing compound (a2) , The reaction temperature, pressure, solvent, time, presence or absence of catalyst, and type of catalyst can be appropriately selected. In this way, the functional group present in the acrylic copolymer (a1) reacts with the functional group in the unsaturated group-containing compound (a2) to introduce the unsaturated group into the side of the acrylic copolymer (a1) Chain, an active energy ray-curable polymer (A) can be obtained.

藉此所獲得的活性能量射線硬化性聚合物(A)的重量平均分子量(Mw),以1萬以上為佳,特別是以15萬以上為佳,進一步以20萬以上為佳。此外,該重量平均分子量(Mw)以150萬以下為佳,特別是以100萬以下為佳,進一步以80萬以下為佳。且,在本說明書中的重量平均分子量(Mw),為藉由凝膠滲透層析法(GPC法)所測定的標準聚苯乙烯換算的値。The weight average molecular weight (Mw) of the active energy ray-curable polymer (A) thus obtained is preferably 10,000 or more, particularly preferably 150,000 or more, and more preferably 200,000 or more. In addition, the weight average molecular weight (Mw) is preferably 1.5 million or less, particularly preferably 1 million or less, and further preferably 800,000 or less. In addition, the weight average molecular weight (Mw) in this specification is a value in terms of standard polystyrene measured by gel permeation chromatography (GPC method).

當活性能量射線硬化性黏著劑為以活性能量射線硬化性聚合物(A)之類的具有活性能量射線硬化性的聚合物作為主成分時,活性能量射線硬化性黏著劑亦可進一步含有活性能量射線硬化性的單體及/或寡聚物(B)。When the active energy ray-curable adhesive contains active energy ray-curable polymer (A) as the main component, the active energy ray-curable adhesive may further contain active energy Radiation-curable monomers and/or oligomers (B).

作為活性能量射線硬化性的單體及/或寡聚物(B),可使用例如,多元醇與(甲基)丙烯酸的酯等。As the active energy ray-curable monomer and/or oligomer (B), for example, an ester of a polyol and (meth)acrylic acid can be used.

作為相關活性能量射線硬化性的單體及/或寡聚物(B),可列舉,例如,環己基(甲基)丙烯酸酯、異莰基(甲基)丙烯酸酯等的單官能性丙烯酸酯類、三羥甲基丙烷三(甲基)丙烯酸酯、新戊四醇三(甲基)丙烯酸酯、新戊四醇四(甲基)丙烯酸酯、二新戊四醇六(甲基)丙烯酸酯、1,4-丁二醇二(甲基)丙烯酸酯、1,6-己二醇二(甲基)丙烯酸酯、聚乙二醇二(甲基)丙烯酸酯、二羥甲基三環癸烷二(甲基)丙烯酸酯等的多官能性丙烯酸酯類、聚酯寡(甲基)丙烯酸酯、聚氨酯寡(甲基)丙烯酸酯等。Examples of the active energy ray-curable monomer and/or oligomer (B) include monofunctional acrylates such as cyclohexyl (meth)acrylate and isobornyl (meth)acrylate. Class, trimethylolpropane tri(meth)acrylate, neopentaerythritol tri(meth)acrylate, neopentaerythritol tetra(meth)acrylate, dineopentaerythritol hexa(meth)acrylate Esters, 1,4-butanediol di(meth)acrylate, 1,6-hexanediol di(meth)acrylate, polyethylene glycol di(meth)acrylate, dimethylol tricyclic Polyfunctional acrylates such as decane di(meth)acrylate, polyester oligo(meth)acrylate, urethane oligo(meth)acrylate, etc.

對於活性能量射線硬化性聚合物(A),調配活性能量射線硬化性的單體及/或寡聚物(B)時,在活性能量射線硬化性黏著劑中的活性能量射線硬化性的單體及/或寡聚物(B)的含量,相對於活性能量射線硬化性聚合物(A)100質量份,以超過0質量份為佳,特別是以60質量份以上為佳。此外,該含量相對於活性能量射線硬化性聚合物(A)100質量份,以250質量份以下為佳,特別是以200質量份以下為佳。For the active energy ray curable polymer (A), when the active energy ray curable monomer and/or oligomer (B) are formulated, the active energy ray curable monomer in the active energy ray curable adhesive And/or the content of the oligomer (B) is preferably more than 0 parts by mass relative to 100 parts by mass of the active energy ray-curable polymer (A), particularly preferably 60 parts by mass or more. In addition, the content is preferably 250 parts by mass or less with respect to 100 parts by mass of the active energy ray-curable polymer (A), particularly preferably 200 parts by mass or less.

在此,使用紫外線作為用以使活性能量射線硬化性黏著劑硬化的活性能量射線時,以添加光聚合起始劑(C)為佳。藉由此光聚合起始劑(C)的使用,可減少聚合硬化時間以及光線照射量。Here, when ultraviolet rays are used as active energy rays for curing the active energy ray-curable adhesive, it is preferable to add a photopolymerization initiator (C). By using the photopolymerization initiator (C), the polymerization curing time and the amount of light irradiation can be reduced.

作為光聚合起始劑(C)的具體例,可列舉,二苯甲酮、苯乙酮、苯偶姻、苯偶姻甲醚、苯偶姻乙醚、苯偶姻異丙醚、苯偶姻異丁醚、苯偶姻安息香酸、苯偶姻安息香酸甲酯、苯偶姻二甲基縮酮、2,4-二乙基噻吨酮(2,4-diethyl thioxanthone)、1-羥基環己基苯基酮、苄基二苯基硫醚(benzyl diphenyl sulfide)、一硫化四甲基秋蘭姆(tetramethylthiuram monosulfide)、偶氮雙異丁腈、苄、聯苄、聯乙醯、β-氯蒽醌、(2,4,6-三甲基苄基二苯基)膦氧化物、2-苯并噻唑-N,N-二乙基二硫胺基甲酸酯、寡{2-羥基-2-甲基-1-[4-(1-丙烯基)苯基]丙酮}、2,2-二甲氧基-1,2-二苯基乙烷-1-酮、2-羥基-1-{4-[4-(2-羥基-2-甲基-丙醯基)-苄基]苯基}-2-甲基-丙烷-1-酮等。此等當中,以使用2-羥基-1-{4-[4-(2-羥基-2-甲基-丙醯基)-苄基]苯基}-2-甲基-丙烷-1-酮為佳。此等可單獨使用,亦可併用2種以上。Specific examples of the photopolymerization initiator (C) include benzophenone, acetophenone, benzoin, benzoin methyl ether, benzoin ethyl ether, benzoin isopropyl ether, benzoin Isobutyl ether, benzoin benzoic acid, benzoin methyl benzoate, benzoin dimethyl ketal, 2,4-diethyl thioxanthone (2,4-diethyl thioxanthone), 1-hydroxy ring Hexyl phenyl ketone, benzyl diphenyl sulfide, tetramethylthiuram monosulfide, azobisisobutyronitrile, benzyl, bibenzyl, biacetyl, β-chloride Anthraquinone, (2,4,6-trimethylbenzyldiphenyl) phosphine oxide, 2-benzothiazole-N,N-diethyldithiocarbamate, oligo{2-hydroxy- 2-Methyl-1-[4-(1-propenyl)phenyl]acetone}, 2,2-dimethoxy-1,2-diphenylethane-1-one, 2-hydroxy-1 -{4-[4-(2-Hydroxy-2-methyl-propanyl)-benzyl]phenyl}-2-methyl-propan-1-one and the like. Among these, 2-hydroxy-1-{4-[4-(2-hydroxy-2-methyl-propanyl)-benzyl]phenyl}-2-methyl-propan-1-one Better. These can be used alone or in combination of two or more kinds.

將光聚合起始劑(C)相對於活性能量射線硬化性聚合物(A)(當調配有活性能量射線硬化性的單體及/或寡聚物(B)時,活性能量射線硬化性聚合物(A)以及活性能量射線硬化性的單體及/或寡聚物(B)的合計量100質量份)100質量份,以使用1質量份以上為佳,特別是0.5質量份以上的量為佳。此外,光聚合起始劑(C)相對於活性能量射線硬化性聚合物(A)(當調配有活性能量射線硬化性的單體及/或寡聚物(B)時,活性能量射線硬化性聚合物(A)以及活性能量射線硬化性的單體及/或寡聚物(B)的合計量100質量份)100質量份,以使用10質量份以下為佳,特別是以6質量份以下的量為佳。The photopolymerization initiator (C) is relative to the active energy ray curable polymer (A) (when an active energy ray curable monomer and/or oligomer (B) is prepared, the active energy ray curable polymer The total amount of the substance (A) and active energy ray-curable monomer and/or oligomer (B) (100 parts by mass)) 100 parts by mass, preferably 1 part by mass or more, especially 0.5 parts by mass or more Better. In addition, the photopolymerization initiator (C) is relative to the active energy ray hardenable polymer (A) (when active energy ray hardenable monomers and/or oligomers (B) are prepared, the active energy ray hardenable polymer The total amount of the polymer (A) and the active energy ray-curable monomer and/or oligomer (B) (100 parts by mass)) 100 parts by mass, preferably 10 parts by mass or less, especially 6 parts by mass or less The amount is better.

在活性能量射線硬化性黏著劑中,上述成分以外,亦可調配適合的其他成分。作為其他成分,可列舉,例如,活性能量射線非硬化性聚合物成分或寡聚物成分(D)、交聯劑(E)等。In the active energy ray-curable adhesive, other suitable components may be blended in addition to the above-mentioned components. Examples of other components include active energy ray non-curable polymer components or oligomer components (D), crosslinking agents (E), and the like.

作為活性能量射線非硬化性聚合物成分或寡聚物成分(D),可列舉,例如,聚丙烯酸酯、聚酯、聚氨酯、聚碳酸酯、聚烯烴等,以重量平均分子量(Mw)為3000~250萬的聚合物或寡聚物為佳。藉由將該成分(D)調配於活性能量射線硬化性黏著劑中,可改善硬化前的黏著性以及剝離性、硬化後的強度、與其他層的接著性、存放安定性等。該成分(D)的配合量並無特別限定,相對於活性能量射線硬化性聚合物(A)100質量份,適當決定為超過0質量份,50質量份以下的範圍。Examples of the active energy ray non-curable polymer component or oligomer component (D) include, for example, polyacrylate, polyester, polyurethane, polycarbonate, polyolefin, etc., with a weight average molecular weight (Mw) of 3000 ~2.5 million polymers or oligomers are preferred. By blending the component (D) in an active energy ray-curable adhesive, the adhesiveness and peelability before curing, the strength after curing, the adhesion to other layers, storage stability, etc. can be improved. The compounding amount of the component (D) is not particularly limited, and it is appropriately determined in the range of more than 0 parts by mass and 50 parts by mass or less with respect to 100 parts by mass of the active energy ray-curable polymer (A).

從易於調整黏著劑層13的貯藏模數在期望的範圍中的觀點而言,以使用交聯劑(E)為佳。作為交聯劑(E),可以使用具有與活性能量射線硬化性聚合物(A)等所具有的官能基的反應性的多官能性化合物。作為此類多官能性化合物的例子,可列舉,異氰酸酯化合物、環氧化合物、胺化合物、三聚氰胺化合物、氮丙啶化合物、肼化合物、醛化合物、㗁唑啉化合物、烷氧基金屬(metal alkoxide)化合物、金屬螫合物化合物、金屬鹽、銨鹽、反應性苯酚樹脂等。From the viewpoint that it is easy to adjust the storage modulus of the adhesive layer 13 in a desired range, it is preferable to use the crosslinking agent (E). As the crosslinking agent (E), a polyfunctional compound having reactivity with a functional group possessed by the active energy ray-curable polymer (A) or the like can be used. Examples of such polyfunctional compounds include isocyanate compounds, epoxy compounds, amine compounds, melamine compounds, aziridine compounds, hydrazine compounds, aldehyde compounds, oxazoline compounds, and metal alkoxides. Compounds, metal chelate compounds, metal salts, ammonium salts, reactive phenol resins, etc.

交聯劑(E)的調配量,相對於活性能量射線硬化性聚合物(A)100質量份,以0.01質量份以上為佳,特別是以0.1質量份以上為佳。此外,交聯劑(E)的調配量,相對於活性能量射線硬化性聚合物(A)100質量份,以10質量份以下為佳,特別是以5質量份以下為佳。The compounding amount of the crosslinking agent (E) is preferably 0.01 parts by mass or more, and particularly preferably 0.1 parts by mass or more, relative to 100 parts by mass of the active energy ray curable polymer (A). In addition, the compounding amount of the crosslinking agent (E) is preferably 10 parts by mass or less, and particularly preferably 5 parts by mass or less, relative to 100 parts by mass of the active energy ray curable polymer (A).

接著,針對活性能量射線硬化性黏著劑為以活性能量射線非硬化性聚合物成分與具有至少1個以上的活性能量射線硬化性基的單體及/或寡聚物的混合物作為主成分的情況,以下進行說明。Next, for the case where the active energy ray curable adhesive is a mixture of an active energy ray non-curable polymer component and a monomer and/or oligomer having at least one active energy ray curable group as the main component , The following is an explanation.

作為活性能量射線非硬化性聚合物成分,例如,可使用與上述丙烯酸系共聚物(a1)相同的成分。As the active energy ray non-curable polymer component, for example, the same component as the above-mentioned acrylic copolymer (a1) can be used.

作為具有至少1個以上的活性能量射線硬化性基的單體及/或寡聚物,可選擇與上述成分(B)相同者。活性能量射線非硬化性聚合物成分與具有至少1個以上的活性能量射線硬化性基的單體及/或寡聚物的調配比,相對於活性能量射線非硬化性聚合物成分100質量份,以具有至少1個以上的活性能量射線硬化性基的單體及/或寡聚物為1質量份以上者為佳,特別是以60質量份以上者為佳。此外,該調配比,相對於活性能量射線非硬化性聚合物成分100質量份,以具有至少1個以上的活性能量射線硬化性基的單體及/或寡聚物為200質量份以下者為佳,特別是以160質量份以下者為佳。As the monomer and/or oligomer having at least one active energy ray-curable group, the same as the above-mentioned component (B) can be selected. The blending ratio of the active energy ray non-curable polymer component and the monomer and/or oligomer having at least one active energy ray hardenable group is relative to 100 parts by mass of the active energy ray non-curable polymer component, The monomer and/or oligomer having at least one active energy ray-curable group is preferably 1 part by mass or more, particularly preferably 60 parts by mass or more. In addition, the blending ratio is based on 100 parts by mass of the active energy ray non-curable polymer component, and the monomer and/or oligomer having at least one active energy ray-curable group is 200 parts by mass or less. Preferably, it is particularly preferably 160 parts by mass or less.

即使在此情形中,仍與上述相同,可適當調配光聚合起始劑(C)、交聯劑(E)。Even in this case, it is the same as the above, and the photopolymerization initiator (C) and the crosslinking agent (E) can be appropriately formulated.

黏著劑層13在25℃的貯藏模數,以50kPa以上為佳,特別是以70kPa以上為佳,進一步以100kPa以上為佳。藉由黏著劑層13在25℃的貯藏模數為50kPa以上,相較於黏著劑層13在25℃的貯藏模數,變得比較容易滿足中間層12在25℃的貯藏模數一方比較低的關係。此外,黏著劑層13在25℃的貯藏模數,以300kPa以下為佳,特別是以200kPa以下為佳,進一步以150kPa以下為佳。藉由上述貯藏模數為300kPa以下,本實施形態相關的工件加工用片材1,變得易於對於凹凸構造發揮更佳的埋入性。且,在本說明書中,黏著劑層13在25℃的貯藏模數,是指即使黏著劑層13為是由活性能量射線硬化性黏著劑所構成,對黏著劑層13照射活性能量射線之前所測定的在25℃的貯藏模數。該貯藏模數的測定方法的詳情如下述試驗例中所記載。The storage modulus of the adhesive layer 13 at 25° C. is preferably 50 kPa or more, especially 70 kPa or more, and more preferably 100 kPa or more. Since the storage modulus of the adhesive layer 13 at 25°C is 50kPa or more, compared to the storage modulus of the adhesive layer 13 at 25°C, it is easier to meet the storage modulus of the intermediate layer 12 at 25°C. Low relationship. In addition, the storage modulus of the adhesive layer 13 at 25° C. is preferably 300 kPa or less, especially 200 kPa or less, and further preferably 150 kPa or less. When the storage modulus is 300 kPa or less, the work processing sheet 1 according to the present embodiment can easily exhibit better embedding properties in the uneven structure. In addition, in this specification, the storage modulus of the adhesive layer 13 at 25°C means that even if the adhesive layer 13 is composed of an active energy ray-curable adhesive, the adhesive layer 13 is irradiated with the active energy ray. The measured storage modulus at 25°C. The details of the measurement method of this storage modulus are as described in the following test example.

黏著劑層13的厚度,以5μm以上為佳,特別是以10μm以上為佳,進一步以15μm以上為佳。藉由黏著劑層13的厚度為5μm以上,本實施形態相關的工件加工用片材1變得易於發揮期望的黏著性。此外,黏著劑層13的厚度,以60μm以下為佳,特別是以45μm以下為佳,進一步以30μm以下為佳。藉由黏著劑層13的厚度為60μm以下,工件加工用片材1變得易於滿足抗彎曲性的條件。此外,藉由黏著劑層13的厚度為60μm以下,從硬化後的黏著劑層13將被附著物進行分離時,變得易於分離。The thickness of the adhesive layer 13 is preferably 5 μm or more, especially 10 μm or more, and further preferably 15 μm or more. When the thickness of the adhesive layer 13 is 5 μm or more, the workpiece processing sheet 1 according to this embodiment can easily exhibit desired adhesiveness. In addition, the thickness of the adhesive layer 13 is preferably 60 μm or less, particularly preferably 45 μm or less, and further preferably 30 μm or less. When the thickness of the adhesive layer 13 is 60 μm or less, the sheet 1 for workpiece processing can easily satisfy the condition of bending resistance. In addition, since the thickness of the adhesive layer 13 is 60 μm or less, when the adherend is separated from the cured adhesive layer 13, it becomes easy to separate.

(3)中間層 在本實施形態中的中間層12,只要是能達成中間層12與黏著劑層13之間的貯藏模數的關係,則無特別限定。作為構成中間層12的材料,以使用從易於達成貯藏模數相關的條件的觀點而言特定的樹脂為佳,進一步從製造的容易性的觀點而言,以中間層12為由黏著劑所構成者為佳。(3) Middle layer The intermediate layer 12 in the present embodiment is not particularly limited as long as the storage modulus relationship between the intermediate layer 12 and the adhesive layer 13 can be achieved. As the material constituting the intermediate layer 12, it is preferable to use a specific resin from the standpoint of easily achieving conditions related to the storage modulus, and from the standpoint of ease of manufacture, the intermediate layer 12 is made of an adhesive. The one is better.

作為用以構成中間層12的黏著劑,可使用作為用以構成黏著劑層13的黏著劑的上述者。在此,由於對於中間層12不會被直接貼附在工件件,不必要考慮對於加工後的工件件剝離的容易性。由此觀點而言,用以構成中間層12的黏著劑,以不具有活性能量射線硬化性的黏著劑為佳。As the adhesive for forming the intermediate layer 12, the above-mentioned adhesives for forming the adhesive layer 13 can be used. Here, since the intermediate layer 12 will not be directly attached to the workpiece, it is not necessary to consider the ease of peeling the workpiece after processing. From this point of view, the adhesive used to form the intermediate layer 12 is preferably an adhesive that does not have active energy ray curability.

作為用以中間層12的黏著劑的不具有活性能量射線硬化性的黏著劑,可使用與上述丙烯酸系共聚物(a1)相同成分。在此,在丙烯酸系共聚物(a1)中,由含官能基的單體及(甲基)丙烯酸烷基酯導出的構成單元的含量可與在黏著劑層13中的含量相同。As an adhesive which does not have active energy ray curability as an adhesive used for the intermediate layer 12, the same components as the above-mentioned acrylic copolymer (a1) can be used. Here, in the acrylic copolymer (a1), the content of the structural unit derived from the functional group-containing monomer and the alkyl (meth)acrylate may be the same as the content in the adhesive layer 13.

此外,在用以構成中間層12的黏著劑中,以含有交聯劑(E)為佳,此時的交聯劑(E)的調配量,可以與在黏著劑層13中的調配量相同。In addition, the adhesive used to form the intermediate layer 12 preferably contains the crosslinking agent (E). The blending amount of the crosslinking agent (E) at this time can be the same as the blending amount in the adhesive layer 13 .

在本實施形態相關的工件加工用片材1中,中間層12在25℃的貯藏模數為比黏著劑層13在25℃的貯藏模數更低。如此一來,工件加工用片材1成為能維持黏著劑層13的耐工件黏著力之類的性能在期望的範圍,同時對於在表面具備凹凸構造的工件件中該凹凸構造能發揮良好的埋入性者。由此觀點而言,以中間層12在25℃的貯藏模數比黏著劑層13在25℃的貯藏模數低20kPa以上為佳,特別是低30kPa以上為佳,進一步以低40kPa以上為佳。In the sheet 1 for workpiece processing according to the present embodiment, the storage modulus of the intermediate layer 12 at 25°C is lower than the storage modulus of the adhesive layer 13 at 25°C. In this way, the workpiece processing sheet 1 can maintain the performance of the adhesive layer 13 such as resistance to workpiece adhesion within a desired range, and at the same time, it can exhibit good embedding of the uneven structure in the workpiece having uneven structure on the surface. Entrants. From this point of view, it is better that the storage modulus of the intermediate layer 12 at 25°C is lower than the storage modulus of the adhesive layer 13 at 25°C by 20 kPa or more, especially 30 kPa or more, and more preferably 40 kPa or more. .

中間層12在25℃的貯藏模數,以260kPa以下為佳,特別是以160kPa以下為佳,進一步以70kPa以下為佳。藉由中間層12在25℃的貯藏模數為260kPa以下,便得易於達成中間層12與黏著劑層13之間上述的貯藏模數的關係。此外,中間層12在25℃的貯藏模數,以10kPa以上為佳,特別是以20kPa以上為佳,進一步以30kPa以上為佳。藉由上述貯藏模數為10kPa以上,本實施形態相關的工件加工用片材1成為易於滿足關於抗彎曲性的條件。且,上述貯藏模數的測定方法的詳情如上述試驗例中所記載。The storage modulus of the intermediate layer 12 at 25°C is preferably 260 kPa or less, particularly preferably 160 kPa or less, and further preferably 70 kPa or less. Since the storage modulus of the intermediate layer 12 at 25° C. is 260 kPa or less, the aforementioned storage modulus relationship between the intermediate layer 12 and the adhesive layer 13 can be easily achieved. In addition, the storage modulus of the intermediate layer 12 at 25°C is preferably 10 kPa or more, particularly 20 kPa or more, and further preferably 30 kPa or more. When the storage modulus is 10 kPa or more, the sheet 1 for processing a workpiece according to the present embodiment can easily satisfy the condition regarding bending resistance. In addition, the details of the method for measuring the storage modulus are as described in the above test example.

在本實施形態相關的工件加工用片材1中,中間層12的厚度為50μm以上,以超過50μm為佳,特別是以70μm以上為佳,進一步以100μm以上為佳。藉由中間層12的厚度為50μm以上,即使對於具有高低差比較大的凹凸構造的工件件,可發揮良好的埋入性。此外,中間層12的厚度以300μm以下為佳。藉由中間層12的厚度為300μm以下,在工件加工用片材1的使用時,可有效地抑制構成中間層12的成分由中間層12滲出,變得可良好地進行工件的加工。In the workpiece processing sheet 1 according to this embodiment, the thickness of the intermediate layer 12 is 50 μm or more, preferably more than 50 μm, particularly preferably 70 μm or more, and more preferably 100 μm or more. When the thickness of the intermediate layer 12 is 50 μm or more, even a workpiece having a concave-convex structure with a relatively large height difference can exhibit good embedding properties. In addition, the thickness of the intermediate layer 12 is preferably 300 μm or less. When the thickness of the intermediate layer 12 is 300 μm or less, when the sheet 1 for workpiece processing is used, the components constituting the intermediate layer 12 can be effectively suppressed from oozing out of the intermediate layer 12, and the workpiece can be processed favorably.

此外,中間層12的厚度與黏著劑層13的厚度的合計,從易於發揮良好的埋入性的觀點而言,本實施形態相關的工件加工用片材1,以成為存在於所使用的工件件上的凹凸構造的凸部的高度的1.2倍以上的厚度為佳,特別是以2倍以上的厚度為佳。再者,中間層12的厚度,從易於發揮良好的埋入性的觀點而言,以比黏著劑層13的厚度更厚為佳。In addition, the total thickness of the intermediate layer 12 and the thickness of the adhesive layer 13, from the viewpoint of easy to exhibit good embedding properties, the workpiece processing sheet 1 related to this embodiment is present in the workpiece used The thickness of the convex portion of the concavo-convex structure on the part is preferably 1.2 times or more, and more preferably 2 times or more. In addition, the thickness of the intermediate layer 12 is preferably thicker than the thickness of the adhesive layer 13 from the viewpoint of easily exhibiting good embedding properties.

(4)剝離片材 本實施形態相關的工件加工用片材1,將黏著劑層13中的與中間層12相反側的面(以下,有時稱為「黏著面」)貼附至工件為止的期間,以保護該面為目的,易可在該面積層剝離片材。剝離片材的構成為任意,以塑料膜藉由剝離劑等進行剝離處理者為例。作為塑料膜的具體例,可列舉,聚對苯二甲酸乙二酯、聚對苯二甲酸丁二酯、聚萘二甲酸乙二酯等的聚酯膜,以及聚丙烯、聚乙烯等的聚烯烴膜。作為剝離劑,可使用矽酮系、氟系、長鏈烷系等,此等當中,以便宜可獲得安定性能的矽酮系為佳。關於剝離片材的厚度,並無特別限制,但通常為20μm以上,250μm以下。(4) Peel the sheet The workpiece processing sheet 1 related to this embodiment protects the surface of the adhesive layer 13 on the opposite side of the intermediate layer 12 (hereinafter, sometimes referred to as "adhesive surface") to the workpiece. For the purpose of noodles, it is easy to peel off the sheet in this area. The configuration of the release sheet is arbitrary, and the plastic film is subjected to release treatment with a release agent or the like as an example. Specific examples of plastic films include polyester films such as polyethylene terephthalate, polybutylene terephthalate, and polyethylene naphthalate, and polyamides such as polypropylene and polyethylene. Olefin film. As the release agent, silicone-based, fluorine-based, long-chain alkane-based, etc. can be used. Among these, silicone-based products that can provide stable performance at low cost are preferred. The thickness of the release sheet is not particularly limited, but it is usually 20 μm or more and 250 μm or less.

2.工件加工用片材的物性 本實施形態相關的工件加工用片材1,藉由以JIS L1086:2007為基準的懸臂法所測定的工件加工用片材1的抗彎曲性為70mm以下。藉由抗彎曲性為70mm以下,本實施形態相關的工件加工用片材1,可良好地抑制在使用時的皺褶的發生。一般而言,工件加工用片材配合所貼附的對象(例如,晶圓以及框架)的形狀加以裁切後,貼附在該貼附對象。像這樣經裁切的工件加工用片材,在貼附時容易有皺褶發生。特別是比起在貼附對象上貼附開端附近的位置,在貼附終端附近的位置上皺褶更容易發生。因此,根據本實施形態相關的工件加工用片材1,即使是該皺褶仍可良好的抑制。由此類觀點而言,上述的抗彎曲性,以50mm以下為佳,特別是以40mm以下為佳。2. Physical properties of sheets for workpiece processing The sheet 1 for workpiece processing according to this embodiment has a bending resistance of 70 mm or less as measured by the cantilever method based on JIS L1086:2007. Since the bending resistance is 70 mm or less, the work processing sheet 1 according to this embodiment can well suppress the occurrence of wrinkles during use. Generally speaking, a workpiece processing sheet is cut according to the shape of an attached object (for example, a wafer and a frame), and then attached to the attached object. Such a cut sheet for workpiece processing is prone to wrinkles when it is attached. In particular, wrinkles are more likely to occur at locations near the attachment end than at locations near the attachment start end on the attachment target. Therefore, according to the workpiece processing sheet 1 according to this embodiment, even the wrinkles can be suppressed satisfactorily. From such a viewpoint, the above-mentioned bending resistance is preferably 50 mm or less, and particularly preferably 40 mm or less.

此外,本實施形態相關的工件加工用片材1,上述的抗彎曲性以10mm以上為佳。藉由上述抗彎曲性為10mm以上,在貼附在貼附對象上的狀態的工件加工用片材1中,因張力的影響引起的變形變得不易發生,其結果為容易達成對於凹凸構造有更良好的埋入性。此外,藉由上述的抗彎曲性為10mm以上,而成為工件加工用片材1的操作性變得更良好者。且,上述的抗彎曲性的測定方法的詳情如下述試驗例中所記載。In addition, in the sheet 1 for processing a workpiece according to the present embodiment, the above-mentioned bending resistance is preferably 10 mm or more. With the above-mentioned bending resistance of 10 mm or more, in the workpiece processing sheet 1 attached to the attachment target, deformation due to the influence of tension becomes less likely to occur, and as a result, it is easy to achieve an uneven structure. Better embedding. In addition, since the above-mentioned bending resistance is 10 mm or more, the workability of the sheet 1 for workpiece processing becomes better. In addition, the details of the above-mentioned bending resistance measurement method are as described in the following test examples.

3.工件加工用片材的製造方法 本實施形態相關的工件加工用片材1的製造方法並無特別限定。作為較佳的製造方法,可列舉,準備基材11與中間層12的積層體,以及黏著劑層13與剝離片材的積層體後,以中間層12與黏著劑層13接觸的方式而貼合此等積層體的方法。3. Manufacturing method of sheet for workpiece processing The manufacturing method of the sheet 1 for workpiece processing concerning this embodiment is not specifically limited. As a preferable manufacturing method, a laminate of the base material 11 and the intermediate layer 12 is prepared, and the laminate of the adhesive layer 13 and the release sheet is prepared, and then attached so that the intermediate layer 12 contacts the adhesive layer 13 The method of combining these laminates.

上述2種積層體的形成,可藉由已知的方法進行。例如,調製含有用以形成中間層12的黏著性組合物,以及根據需要進一步有溶媒或分散媒的塗佈液,將該塗佈液塗佈在基材11的單面上而可形成塗膜,使該塗膜乾燥而形成中間層12。如此一來,可獲得基材11與中間層12的積層體。此外,調製含有用以形成黏著劑層13的黏著性組合物,以及根據需要進一步有溶媒或分散媒的塗佈液,將該塗佈液塗佈在剝離片材的剝離面上而形成塗膜,使該塗膜乾燥而可形成黏著劑層13。如此一來,可獲得黏著劑層13與剝離片材的積層體。The formation of the above-mentioned two types of laminates can be performed by a known method. For example, a coating liquid containing an adhesive composition for forming the intermediate layer 12, and a solvent or a dispersing medium as necessary is prepared, and the coating liquid is applied to one side of the substrate 11 to form a coating film , The coating film is dried to form the intermediate layer 12. In this way, a laminate of the base material 11 and the intermediate layer 12 can be obtained. In addition, a coating liquid containing an adhesive composition for forming the adhesive layer 13 and a solvent or a dispersion medium as necessary is prepared, and the coating liquid is applied to the release surface of the release sheet to form a coating film , The coating film is dried to form the adhesive layer 13. In this way, a laminate of the adhesive layer 13 and the release sheet can be obtained.

如上述,塗佈液的塗佈可藉由已知的方法進行,例如,可藉由桿塗佈法、刀式塗佈法、輥塗佈法、刮刀塗佈法、模具塗佈法、凹版塗佈法等進行。且,塗佈液只要是可進行塗佈則其特性並無特限定,用以形成中間層11或黏著劑層13的成分有時含有作為溶質,有時含有作為分散質。此外,剝離片材作為製程材料可剝離,亦可在貼附至工件件為止的期間,保護黏著劑層13。As mentioned above, the coating of the coating liquid can be carried out by known methods, for example, bar coating, knife coating, roll coating, knife coating, die coating, gravure coating Coating method etc. are carried out. In addition, the characteristics of the coating liquid are not particularly limited as long as it can be applied, and the components used to form the intermediate layer 11 or the adhesive layer 13 may be contained as a solute or as a dispersant. In addition, the release sheet can be peeled off as a process material, and it can also protect the adhesive layer 13 during the time it is attached to the workpiece.

用以形成黏著劑層13的黏著性組合物含有交聯劑(E)時,以藉由變更上述的乾燥條件(溫度、時間等),或藉由額外設置加熱處理,使塗膜內的活性能量射線硬化性聚合物(A)與交聯劑(E)的交聯反應進行,在黏著劑層13內以期望的存在密度形成交聯構造為佳。用以形成中間層12的黏著性組合物含有交聯劑(E)時也相同,以使塗膜內的丙烯酸系共聚物(a1)與交聯劑(E)的交聯反應進行為佳。再者,為了使上述交聯反應充分地進行,在使上述2種的積層體貼合後,亦可進行例如,在23℃,相對溼度50%的環境中靜置數日的所謂的熟成。When the adhesive composition used to form the adhesive layer 13 contains the cross-linking agent (E), it can be activated by changing the drying conditions (temperature, time, etc.) mentioned above, or by additionally providing heat treatment. The cross-linking reaction between the energy ray-curable polymer (A) and the cross-linking agent (E) progresses, and it is preferable to form a cross-linked structure in the adhesive layer 13 at a desired density. The same applies when the adhesive composition for forming the intermediate layer 12 contains a crosslinking agent (E), and it is preferable that the crosslinking reaction of the acrylic copolymer (a1) and the crosslinking agent (E) in the coating film proceeds. In addition, in order to fully advance the crosslinking reaction, after bonding the above-mentioned two types of laminates, for example, so-called maturation of standing for several days in an environment at 23° C. and a relative humidity of 50% may be performed.

4.工件加工用片材的使用方法 本實施形態相關的工件加工用片材1可以使用在於表面具備凹凸構造的工件件的加工。亦即,可將本實施形態相關的工件加工用片材1的黏著面貼附在上述工件件中有凹凸構造存在的面上後,於工件加工用片材1上進行上述工件的加工。對應該加工,本實施形態相關的工件加工用片材1可作為背面研磨(back grinding)片材、切割片材、擴展(expanding)片材、撿晶(pick-up)片材等而使用。4. How to use sheets for workpiece processing The workpiece processing sheet 1 according to the present embodiment can be used for processing a workpiece having an uneven structure on the surface. That is, after the adhesive surface of the workpiece processing sheet 1 according to the present embodiment is attached to the surface where the uneven structure exists in the workpiece, the workpiece can be processed on the workpiece processing sheet 1. In response to processing, the workpiece processing sheet 1 related to this embodiment can be used as a back grinding sheet, a dicing sheet, an expanding sheet, a pick-up sheet, and the like.

在此,根據本實施形態相關的工件加工用片材1,如上述,可良好地抑制在將其黏著面貼附在工件件時的工件加工用片材1的皺褶的發生。因此,根據本實施形態相關的工件加工用片材1,變得可良好地進行切割、擴展之類的步驟。Here, according to the workpiece processing sheet 1 according to the present embodiment, as described above, the occurrence of wrinkles in the workpiece processing sheet 1 when the adhesive surface is attached to the workpiece can be favorably suppressed. Therefore, according to the workpiece processing sheet 1 according to the present embodiment, steps such as cutting and spreading can be performed well.

此外,本實施形態相關的工件加工用片材1,如上述,對於存在於工件件表面的凹凸構造可發揮優良的埋入性。因此,根據本實施形態相關的工件加工用片材1,可保護凹凸構造,同時進行希望的加工。作為使用本實施形態相關的工件加工用片材1進行加工的工件件的例子,可列舉,在表面具備凹凸構造的半導體晶圓、半導體封裝等的半導體構件、玻璃板等的玻璃構件。此外,作為上述凹凸構造的例子,可列舉凸塊,特別是可列舉凸狀電極。本實施形態相關的工件加工用片材1特別適合使用在具備貫通電極的TSV晶圓的加工中。In addition, the workpiece processing sheet 1 according to the present embodiment, as described above, can exhibit excellent embedding properties with respect to the uneven structure existing on the surface of the workpiece. Therefore, according to the workpiece processing sheet 1 according to the present embodiment, the uneven structure can be protected while performing desired processing. Examples of workpieces processed using the workpiece processing sheet 1 according to the present embodiment include semiconductor wafers with uneven structures on the surface, semiconductor members such as semiconductor packages, and glass members such as glass plates. In addition, as an example of the above-mentioned concavo-convex structure, bumps, particularly convex electrodes, can be cited. The workpiece processing sheet 1 according to this embodiment is particularly suitable for use in the processing of TSV wafers provided with through electrodes.

在此,關於在表面具有凸塊的工件件中的凸塊的形狀、位置,雖然並無特別限定,但該凸塊的高度可以是50μm以上,特別是可超過50μm,進一步可以是70μm以上。根據本實施形態相關的工件加工用片材1,即使是對於這種高度比較高的凸塊,仍可發揮良好的埋入性。Here, although the shape and position of the bumps in the workpiece having bumps on the surface are not particularly limited, the height of the bumps may be 50 μm or more, especially 50 μm or more, and further 70 μm or more. According to the workpiece processing sheet 1 according to this embodiment, even for such a relatively high bump, it can still exhibit good embedding properties.

在本實施形態相關的工件加工用片材1上的工件的加工結束,將加工後的工件從工件加工用片材1進行分離時,以在該分離前對於在工件加工用片材1中的黏著劑層13照射活性能量射線為佳。如此一來,黏著劑層13進行硬化,對於加工後的工件,工件加工用片材1的黏著力良好地降低,加工後的工件的分離變得容易。When the processing of the workpiece on the workpiece processing sheet 1 according to the present embodiment is completed, and the processed workpiece is separated from the workpiece processing sheet 1, the workpiece in the workpiece processing sheet 1 is separated before the separation. It is preferable that the adhesive layer 13 is irradiated with active energy rays. In this way, the adhesive layer 13 is hardened, the adhesive force of the workpiece processing sheet 1 with respect to the processed workpiece is reduced well, and the separation of the processed workpiece becomes easy.

作為上述活性能量射線,例如,可使用電磁波或帶電粒子射線當中具有能量量子者,具體而言,可使用紫外線、電子射線等。特別是以容易操作的紫外線為佳。紫外線的照射,可藉由高壓水銀燈、氙氣燈、LED等而進行,紫外線的照射量,以照度為50mW/cm2 以上,1000mW/cm2 以下為佳。此外,光量以50mJ/cm2 以上為佳,特別是以80mJ/cm2 以上為佳,進一步以200mJ/cm2 以上為佳。此外,光量以10000mJ/cm2 以下為佳,特別是以5000mJ/cm2 以下為佳,進一步以2000mJ/cm2 以下為佳。另一方面,電子射線的照射可藉由電子射線加速器等而進行,電子射線的照射量,以10krad以上,1000krad以下為佳。As the above-mentioned active energy rays, for example, electromagnetic waves or charged particle rays having an energy quantum can be used. Specifically, ultraviolet rays, electron rays, etc. can be used. Especially the ultraviolet light which is easy to handle is preferred. Ultraviolet rays can be irradiated by high-pressure mercury lamps, xenon lamps, LEDs, etc. The irradiance of ultraviolet rays is preferably 50 mW/cm 2 or more and 1000 mW/cm 2 or less. Further, the light amount of 50mJ / cm 2 or more preferably, in particular in 80mJ / cm 2 or more preferably, is further 200mJ / cm 2 or more is preferable. In addition, the amount of light is preferably 10000 mJ/cm 2 or less, particularly preferably 5000 mJ/cm 2 or less, and more preferably 2000 mJ/cm 2 or less. On the other hand, electron beam irradiation can be performed by an electron beam accelerator or the like, and the irradiation amount of electron beam is preferably 10 krad or more and 1000 krad or less.

以上所說明的實施形態,為用以易於本發明的理解所記載者,並非用以限定本發明者。因此,上述實施形態中所揭示的各元件,以包含本發明所屬技術範圍中全部的設計變更、均等物為主旨。The embodiments described above are described to facilitate the understanding of the present invention, and are not intended to limit the present inventors. Therefore, each element disclosed in the above embodiment is intended to include all design changes and equivalents within the technical scope of the present invention.

例如,在基材11中的與中間層12相反側的面、基材11與中間層12之間,亦可隔著其他的層。 [實施例]For example, another layer may be interposed between the substrate 11 and the intermediate layer 12 on the surface of the substrate 11 opposite to the intermediate layer 12. [Example]

以下,雖然藉由實施例等進一步具體說明本發明,但本發明的範圍並不限定於此等實施例等。Hereinafter, although the present invention will be further specifically described with examples and the like, the scope of the present invention is not limited to these examples and the like.

[實施例1] (1) 基材的製作 將低密度聚乙烯藉由小型T型模具擠出機(東洋精機製作所社製,製品名「LABO PLASTOMILL」)進行擠出成形,獲得厚度70μm的基材。此基材單獨的抗彎曲性以與下述試驗例2同樣的方法進行測定,為19mm。[Example 1] (1) Production of substrate The low-density polyethylene was extruded by a small T-die extruder (manufactured by Toyo Seiki Seisakusho, product name "LABO PLASTOMILL") to obtain a base material with a thickness of 70 μm. The bending resistance of this substrate alone was measured in the same manner as in Test Example 2 below, and it was 19 mm.

(2)中間層用黏著性組合物的調製 使丙烯酸正丁酯70質量份,丙烯酸甲酯20質量份,丙烯酸2-羥乙酯10質量份藉由溶液聚合法進行聚合,獲得(甲基)丙烯酸酯聚合物。此丙烯酸系聚合物的重量平均分子量(Mw)藉由下述方法進行測定,為65萬。(2) Preparation of adhesive composition for intermediate layer 70 parts by mass of n-butyl acrylate, 20 parts by mass of methyl acrylate, and 10 parts by mass of 2-hydroxyethyl acrylate were polymerized by a solution polymerization method to obtain a (meth)acrylate polymer. The weight average molecular weight (Mw) of this acrylic polymer was measured by the following method and was 650,000.

將上述所得的丙烯酸系聚合物100質量份,作為交聯劑的三羥甲基丙烷改質甲伸苯基二異氰酸酯(東曹公司製,製品名「Coronate L」)0.13質量份在溶媒中進行混合,獲得中間層用黏著性組合物的塗佈液。100 parts by mass of the acrylic polymer obtained above, and 0.13 parts by mass of trimethylolpropane modified phenylene diisocyanate (manufactured by Tosoh Corporation, product name "Coronate L") as a crosslinking agent in a solvent They are mixed to obtain a coating liquid of the adhesive composition for an intermediate layer.

(3)黏著劑層用黏著性組合物的調製 使丙烯酸正丁酯83質量份,丙烯酸甲酯10質量份,丙烯酸2-羥乙酯7質量份,藉由溶液聚合法進行聚合,獲得(甲基)丙烯酸酯聚合物。使此(甲基)丙烯酸酯聚合物,與相對於該丙烯酸系共聚物的丙烯酸2-羥乙酯的莫耳數為80莫耳%的甲基丙烯醯基氧基乙基異氰酸酯(MOI)反應,獲得在側鏈導入有活性能量射線硬化性基的丙烯酸系聚合物。此丙烯酸系聚合物的重量平均分子量(Mw)藉由下述方法進行測定,為65萬。(3) Preparation of adhesive composition for adhesive layer 83 parts by mass of n-butyl acrylate, 10 parts by mass of methyl acrylate, and 7 parts by mass of 2-hydroxyethyl acrylate were polymerized by a solution polymerization method to obtain a (meth)acrylate polymer. This (meth)acrylate polymer is reacted with methacryloxyethyl isocyanate (MOI) having a molar number of 80 mol% relative to the 2-hydroxyethyl acrylate of the acrylic copolymer , To obtain an acrylic polymer having an active energy ray-curable group introduced into the side chain. The weight average molecular weight (Mw) of this acrylic polymer was measured by the following method and was 650,000.

上述所得的在側鏈導入有活性能量射線硬化性基的丙烯酸系聚合物100質量份,作為光聚合起始劑的2-羥基-1-{4-[4-(2-羥基-2-甲基-丙醯基)-苄基]苯基}-2-甲基-丙烷-1-酮(BASF社製,製品名「Omnirad 127」)3質量份,作為交聯劑的三羥甲基丙烷改質甲伸苯基二異氰酸酯(東曹公司製,製品名「Coronate L 」)0.43質量份在溶媒中進行混合,獲得黏著劑層用黏著性組合物的塗佈液。100 parts by mass of the acrylic polymer having active energy ray-curable groups introduced into the side chain obtained above, as a photopolymerization initiator, 2-hydroxy-1-{4-[4-(2-hydroxy-2-methyl) -Propyl-propanyl)-benzyl]phenyl}-2-methyl-propan-1-one (manufactured by BASF, product name "Omnirad 127") 3 parts by mass, trimethylolpropane as a crosslinking agent 0.43 parts by mass of modified phenylmethylene diisocyanate (manufactured by Tosoh Corporation, product name "Coronate L") was mixed in a solvent to obtain a coating liquid of an adhesive composition for an adhesive layer.

(4)中間層的形成 對於在上述步驟(1)所製作的基材的單面,塗佈在上述步驟(2)所調製的中間層用黏著性組合物的塗佈液,藉由加熱使其乾燥,在基材上形成厚度150μm的中間層。如此一來,獲得將基材與中間層進行積層而形成的第1積層體。(4) Formation of the intermediate layer For the single side of the substrate prepared in the above step (1), apply the coating liquid of the adhesive composition for the intermediate layer prepared in the above step (2), and heat it to dry, and on the substrate An intermediate layer with a thickness of 150 μm is formed. In this way, a first laminate formed by laminating the base material and the intermediate layer was obtained.

(5)黏著劑層的形成 對於由在厚度38μm的聚對苯二甲酸乙二酯(PET)膜的單面上形成有矽酮系的剝離劑層而成的剝離片材(LINTEC公司製,製品名稱「SP-PET381031」)的剝離面,塗佈上述黏著性組合物的塗佈液,藉由加熱使其乾燥,在剝離片材上,形成厚度20μm的黏著劑層。如此一來,獲得將黏著劑層與剝離片材進行積層而形成的第2積層體。(5) Formation of adhesive layer For a release sheet made by forming a silicone-based release agent layer on one side of a 38μm thick polyethylene terephthalate (PET) film (manufactured by LINTEC, product name "SP-PET381031") On the peeling surface of, apply the coating liquid of the adhesive composition and dry it by heating to form an adhesive layer with a thickness of 20 μm on the peeling sheet. In this way, a second laminate formed by laminating the adhesive layer and the release sheet was obtained.

(6)工件加工用黏著片的製作 藉由將在上述步驟(4)所獲得的第1積層體中的中間層側的面,與在上述步驟(5)所獲得的第2積層體中的黏著劑層側的面進行貼合,獲得工件加工用片材。(6) Production of adhesive sheets for workpiece processing By bonding the surface on the intermediate layer side of the first laminate obtained in the above step (4) and the surface on the adhesive layer side of the second laminate obtained in the above step (5), Obtain a sheet for workpiece processing.

在此,上述的重量平均分子量(Mw)為使用凝膠滲透層析法(GPC),在以下的條件所測定(GPC測定)的換算標準聚苯乙烯的重量平均分子量。 >測定條件> ・測定裝置:東曹公司製,HLC-8320 ・GPC管柱(依以下的順序通過):東曹公司製 TSK gel superH-H TSK gel superHM-H TSK gel SuperH2000 ・測定溶媒:四氫呋喃 ・測定溫度:40℃Here, the above-mentioned weight average molecular weight (Mw) is the weight average molecular weight of the converted standard polystyrene measured (GPC measurement) using gel permeation chromatography (GPC) under the following conditions. >Measurement conditions> ・Measurement device: HLC-8320 manufactured by Tosoh Corporation ・GPC string (pass in the following order): Tosoh Corporation TSK gel superH-H TSK gel superHM-H TSK gel SuperH2000 ・Measuring solvent: Tetrahydrofuran ・Measurement temperature: 40°C

[實施例2~6、比較例1~3] 除了將基材的種類以及厚度,再者中間層的厚度變更如表1所記載以外,其餘與實施例1同樣地製造工件加工用片材。[Examples 2 to 6, Comparative Examples 1 to 3] Except that the type and thickness of the base material and the thickness of the intermediate layer were changed as described in Table 1, the same procedure as in Example 1 was carried out to produce a sheet for workpiece processing.

[試驗例1](貯藏模數的測定) 將在實施例及比較例中所調製的中間層用黏著性組合物,塗佈在由在厚度38μm的聚對苯二甲酸乙二酯製基材膜的單面形成有矽酮系的剝離劑層所構成的剝離片材(LINTEC公司製:SP-PET381031)的剝離面上,藉由加熱使其乾燥,在剝離片材上,形成厚度40μm的中間層。準備複數個藉此所獲得的中間層與剝離片材的積層體。[Test Example 1] (Measurement of Storage Modulus) The adhesive composition for the intermediate layer prepared in the examples and comparative examples was applied to a base film made of polyethylene terephthalate with a thickness of 38 μm and a silicone-based release agent formed on one side The release surface of the release sheet (manufactured by LINTEC Corporation: SP-PET381031) composed of layers was dried by heating to form an intermediate layer with a thickness of 40 μm on the release sheet. A plurality of laminates of the intermediate layer and the release sheet thus obtained are prepared.

使用上述的積層體,將其貼合至中間層成為厚度800μm為止,將所得的中間層的積層體打孔為直徑10mm的圓形,用以測定中間層的黏彈性的試料。然後,藉由黏彈性測定裝置(TA Instruments Japan Inc.製,製品名「ARES」),對上述的試料給予頻率1Hz的變形,測定在-50~150℃的貯藏模數,獲得25℃的貯藏模數的値(kPa)。結果作為中間層的貯藏模數如表1所示。Using the above-mentioned laminate, it was bonded until the intermediate layer had a thickness of 800 μm, and the obtained interlayer laminate was punched into a circle with a diameter of 10 mm to measure the viscoelasticity of the intermediate layer. Then, with a viscoelasticity measuring device (manufactured by TA Instruments Japan Inc., product name "ARES"), the above-mentioned sample was deformed at a frequency of 1 Hz, and the storage modulus at -50 to 150°C was measured to obtain a storage at 25°C. The value of the modulus (kPa). The results are shown in Table 1 as the storage modulus of the intermediate layer.

此外,除了以上述的中間層用黏著性組合物取代在實施例及比較例中所調製的黏著劑層用黏著性組合物以外,其餘與上述同樣地測定在黏著劑層中在25℃的貯藏模數(kPa)。結果作為黏著劑層的貯藏模數如表1所示。In addition, except that the adhesive composition for the intermediate layer was substituted for the adhesive composition for the adhesive layer prepared in the examples and comparative examples, the storage in the adhesive layer at 25°C was measured in the same manner as above. Modulus (kPa). The results are shown in Table 1 as the storage modulus of the adhesive layer.

[試驗例2](抗彎曲性的測定) 針對實施例及比較例所製造的工件加工用片材,藉由以JIS L1086:2007為基準的懸臂法,測定抗彎曲性。具體而言,將在實施例及比較例所製造的工件加工用片材裁斷成2cm×15cm的尺寸後,藉由將剝離片材進行剝離而去除,獲得測定用樣品。以該測定用樣品中黏著劑層側的面朝上的方式,將該測定用樣品載置在45°懸臂測試機的平台。然後,使測定用樣品以一定速度在45°懸臂測試機的斜面方向滑動。記錄當測定用樣品彎曲,與斜面接觸時的滑動量(mm)。此測定使用不同樣品進行5次,計算出平均値。該平均値作為抗彎曲性(mm)如表1所示。[Test Example 2] (Measurement of bending resistance) Regarding the workpiece processing sheets manufactured in the Examples and Comparative Examples, the bending resistance was measured by the cantilever method based on JIS L1086:2007. Specifically, after cutting the workpiece processing sheets manufactured in the Examples and Comparative Examples into a size of 2 cm×15 cm, the peeling sheet was peeled and removed to obtain a measurement sample. The measurement sample was placed on the platform of the 45° cantilever tester so that the adhesive layer side of the measurement sample was facing upward. Then, the measurement sample was slid in the direction of the inclined plane of the 45° cantilever tester at a constant speed. Record the amount of sliding (mm) when the measuring sample is bent and contacts the inclined surface. This measurement was performed 5 times using different samples, and the average value was calculated. The average value is shown in Table 1 as bending resistance (mm).

[試驗例3](皺褶的評價) 將從實施例以及比較例所製造的工件加工用片材將剝離片材進行剝離所露出的黏著劑層的露出面,貼附在矽晶圓及切割用框架。此等操作為使用晶圓貼片機(LINTEC公司製,製品名「RAD-2510F/12」),以貼附壓力:0.2MPa,貼附速度:20mm/s,貼附溫度:40℃的條件進行。[Test Example 3] (Evaluation of Wrinkles) The exposed surface of the adhesive layer exposed by peeling the release sheet from the workpiece processing sheets manufactured in the Examples and Comparative Examples was attached to the silicon wafer and the dicing frame. These operations use a wafer placement machine (manufactured by LINTEC, product name "RAD-2510F/12"), under the conditions of attaching pressure: 0.2MPa, attaching speed: 20mm/s, and attaching temperature: 40℃ get on.

貼附後,在工件加工用片材以目視確認皺褶(特別是在貼附終端部分的皺褶)是否發生。然後,基於以下的基準,針對皺褶的發生的有無進行評價。 〇:皺褶未發生。 ×:皺褶有發生。After sticking, visually confirm whether wrinkles (especially wrinkles at the sticking terminal portion) have occurred on the workpiece processing sheet. Then, based on the following criteria, the occurrence of wrinkles was evaluated. ○: No wrinkles occurred. ×: Wrinkles occurred.

[試驗例4](埋入性的評價) 準備在表面具有凸塊徑:30μm,凸塊間距:100μm,凸塊高度:20μm的凸塊的凸塊晶圓1,以及在表面具有凸塊徑:100μm,凸塊間距:200μm,凸塊高度:80μm的凸塊的凸塊晶圓2。[Test Example 4] (Evaluation of Implantability) Prepare bump wafer 1 with bumps on the surface: 30μm, bump pitch: 100μm, bump height: 20μm, and bump diameter: 100μm, bump pitch: 200μm, bump height on the surface : Bump wafer 2 with 80μm bumps.

將從實施例及比較例所製造的工件加工用片材將剝離片材進行剝離所露出的黏著劑層的露出面貼附在上述凸塊晶圓1及凸塊晶圓2各別的有凸塊存在的面。此時的貼附為使用晶圓保護用黏著片材貼附裝置(LINTEC公司製,製品名「RAD-3510F/12」),以貼附溫度:40℃,貼附速度:5mm/s的條件進行。The exposed surface of the adhesive layer exposed by peeling the release sheet from the workpiece processing sheets manufactured in the examples and comparative examples was attached to the bump wafer 1 and the bump wafer 2 respectively. The face of the block. The attaching at this time is to use the adhesive sheet attaching device for wafer protection (manufactured by LINTEC, product name "RAD-3510F/12"), under the conditions of attaching temperature: 40°C and attaching speed: 5mm/s get on.

然後,黏著片材貼附後的凸塊晶圓的凸塊周圍的氣泡以光學顯微鏡進行觀察,基於以下的基準,各別針對凸塊晶圓1以及凸塊晶圓2,評價凸塊的埋入性。結果如表1所示。 〇:確認幾乎沒有與相鄰的氣泡接觸的氣泡(氣泡彼此獨立地存在)。 △:雖然確認有與一部份相鄰的氣泡接觸的氣泡,但與相鄰的全部氣泡接觸的氣泡則幾乎沒有(一部分氣泡有接觸)。 ×:幾乎全部的氣泡為與相鄰的全部的氣泡有接觸(氣泡彼此接觸)。Then, the bubbles around the bumps of the bump wafer after the adhesive sheet was attached were observed with an optical microscope. Based on the following criteria, the bumping wafer 1 and the bump wafer 2 were evaluated for the embedding of the bumps. Entry. The results are shown in Table 1. ○: It is confirmed that there are almost no bubbles in contact with adjacent bubbles (the bubbles exist independently of each other). △: Although it was confirmed that there were bubbles in contact with some of the adjacent bubbles, there were almost no bubbles in contact with all the adjacent bubbles (some of the bubbles were in contact). ×: Almost all bubbles are in contact with all adjacent bubbles (bubbles are in contact with each other).

且,於表1所記載的縮寫等的詳情如以下。 [基材] LDPE:低密度聚乙烯進行擠出成形而成的基材 PET:聚對苯二甲酸乙二酯膜(東洋紡社製,製品名「COSMOSHINE A4100」) EMAA:在乙烯-甲基丙烯酸共聚物(Dow-Mitsui Polychemicals Company, Ltd製,製品名「NUCREL N0903HC」)進行擠出成形而成的膜上,進行電子射線照射(照射量:110kGy,照射次數:1次,照射面:與中間層接觸的面)所得的基材。In addition, the details of the abbreviations described in Table 1 are as follows. [Substrate] LDPE: Low-density polyethylene as a base material by extrusion PET: Polyethylene terephthalate film (manufactured by Toyobo Co., Ltd., product name "COSMOSHINE A4100") EMAA: Ethylene-methacrylic acid copolymer (manufactured by Dow-Mitsui Polychemicals Company, Ltd., product name "NUCREL N0903HC") was extruded and subjected to electron beam irradiation (exposure amount: 110kGy, number of irradiation times: Once, the irradiated surface: the surface in contact with the intermediate layer) the obtained substrate.

[表1] 基材 中間層 黏著劑層 抗彎曲性(mm) 皺褶的評價 埋入性的評價 種類 厚度(μm) 厚度(μm) 貯藏模數(kPa) 厚度(μm) 貯藏模數(kPa) 凸塊晶圓1(凸塊高度:20μm) 凸塊晶圓2(凸塊高度:80μm) 實施例1 LDPE 70 150 43 20 114 21 實施例2 PET 50 150 43 20 114 43 實施例3 LDPE 70 80 43 20 114 23 實施例4 LDPE 70 50 43 20 114 24 × 實施例5 LDPE 140 150 43 20 114 50 實施例6 EMAA 80 150 43 20 114 25 比較例1 LDPE 70 20 43 20 114 23 × × 比較例2 PET 75 150 43 20 114 75 × 比較例3 PET 100 150 43 20 114 100以上 × [Table 1] Substrate middle layer Adhesive layer Bending resistance (mm) Evaluation of wrinkles Embeddedness evaluation species Thickness (μm) Thickness (μm) Storage modulus (kPa) Thickness (μm) Storage modulus (kPa) Bump wafer 1 (bump height: 20μm) Bump wafer 2 (bump height: 80μm) Example 1 LDPE 70 150 43 20 114 twenty one Example 2 PET 50 150 43 20 114 43 Example 3 LDPE 70 80 43 20 114 twenty three Example 4 LDPE 70 50 43 20 114 twenty four × Example 5 LDPE 140 150 43 20 114 50 Example 6 EMAA 80 150 43 20 114 25 Comparative example 1 LDPE 70 20 43 20 114 twenty three × × Comparative example 2 PET 75 150 43 20 114 75 × Comparative example 3 PET 100 150 43 20 114 Above 100 ×

由表1清楚得知,實施例相關的工件加工用片材對於凸塊具有優異的埋入性,同時可良好地抑制在貼附時的皺褶的發生。 [產業可利用性]It is clear from Table 1 that the workpiece processing sheet according to the example has excellent embedding properties for bumps, and can well suppress the occurrence of wrinkles at the time of attachment. [Industry Availability]

本發明相關的工件加工用片材適合作為用以在表面具備凹凸構造的工件件的切割片等使用。The sheet for workpiece processing according to the present invention is suitable for use as a cutting sheet for workpieces having an uneven structure on the surface.

1:工件加工用片材 11:基材 12:中間層 13:黏著劑層1: Sheet for workpiece processing 11: Substrate 12: Middle layer 13: Adhesive layer

[圖1]本發明一實施形態相關的工件加工用片材的剖面圖。[Fig. 1] A cross-sectional view of a sheet for workpiece processing according to an embodiment of the present invention.

1:工件加工用片材 1: Sheet for workpiece processing

11:基材 11: Substrate

12:中間層 12: Middle layer

13:黏著劑層 13: Adhesive layer

Claims (8)

一種工件加工用片材,為具備: 基材、積層在上述基材的單面側的中間層、以及積層在上述中間層中與上述基材相反的面側的黏著劑層,上述工件加工用片材為用於在表面具備凹凸構造的工件進行加工, 上述中間層在25℃的貯藏模數比上述黏著劑層在25℃的貯藏模數更低, 上述中間層的厚度為50μm以上,300μm以下, 藉由以JIS L1086:2007為基準的懸臂法所測定的上述工件加工用片材的抗彎曲性為70mm以下。A sheet material for workpiece processing, which has: A base material, an intermediate layer laminated on one side of the base material, and an adhesive layer laminated on the side opposite to the base material in the intermediate layer, and the workpiece processing sheet is used to provide an uneven structure on the surface The workpiece is processed, The storage modulus of the intermediate layer at 25°C is lower than the storage modulus of the adhesive layer at 25°C, The thickness of the intermediate layer is 50μm or more and 300μm or less, The bending resistance of the above-mentioned workpiece processing sheet measured by the cantilever method based on JIS L1086:2007 is 70 mm or less. 如請求項1所述之工件加工用片材,其中,上述中間層在25℃的貯藏模數比上述黏著劑層在25℃的貯藏模數低20kPa以上。The sheet for workpiece processing according to claim 1, wherein the storage modulus of the intermediate layer at 25°C is 20 kPa or more lower than the storage modulus of the adhesive layer at 25°C. 如請求項1所述之工件加工用片材,其中,上述中間層在25℃的貯藏模數為10kPa以上,260kPa以下。The sheet for workpiece processing according to claim 1, wherein the storage modulus of the intermediate layer at 25° C. is 10 kPa or more and 260 kPa or less. 如請求項1所述之工件加工用片材,其中,上述黏著劑層在25℃的貯藏模數為50kPa以上,300kPa以下。The sheet for workpiece processing according to claim 1, wherein the storage modulus of the adhesive layer at 25°C is 50 kPa or more and 300 kPa or less. 如請求項1所述之工件加工用片材,其中,上述基材為由聚烯烴系膜所構成。The workpiece processing sheet according to claim 1, wherein the base material is composed of a polyolefin-based film. 如請求項1所述之工件加工用片材,其中,上述黏著劑層為由活性能量射線硬化性黏著劑所構成。The workpiece processing sheet according to claim 1, wherein the adhesive layer is composed of an active energy ray-curable adhesive. 如請求項1所述之工件加工用片材,其中,上述工件為在表面具有凸塊的工件。The sheet for workpiece processing according to claim 1, wherein the workpiece is a workpiece having bumps on the surface. 如請求項7所述之工件加工用片材,其中,上述凸塊的高度為50μm以上。The workpiece processing sheet according to claim 7, wherein the height of the bumps is 50 μm or more.
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