TW202028379A - Resin composition for electrode formation, chip type electronic component and manufacturing method thereof - Google Patents

Resin composition for electrode formation, chip type electronic component and manufacturing method thereof Download PDF

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TW202028379A
TW202028379A TW108134172A TW108134172A TW202028379A TW 202028379 A TW202028379 A TW 202028379A TW 108134172 A TW108134172 A TW 108134172A TW 108134172 A TW108134172 A TW 108134172A TW 202028379 A TW202028379 A TW 202028379A
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resin composition
electrode
forming
resin
type electronic
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TW108134172A
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TWI752350B (en
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髙橋翔
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日商京瓷股份有限公司
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01BCABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
    • H01B1/00Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors
    • H01B1/20Conductive material dispersed in non-conductive organic material
    • H01B1/22Conductive material dispersed in non-conductive organic material the conductive material comprising metals or alloys
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/28Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/488Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/49Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions wire-like arrangements or pins or rods

Abstract

The present invention provides a low-temperature sintered resin composition for electrode formation excellent in bonding properties, resistance to humidity and heat resistance, and the like. The resincomposition for electrode formation is based on (A) thermosetting resin, (B) radical initiator, (C) silver fine particles with a thickness or short diameter of 1 to 200 nm, and (D) average excluding(C) component Silver powder with a particle size of 2 to 20 [mu]m is an essential component. (A) Thermosetting resins include (A1) hydroxyl-containing (meth) acrylate compounds or hydroxyl-containing(meth) acrylamide compounds, (A2) normal temperature The following is at least one selected from liquid bismaleimide resin and (A3) polybutadiene, and its thixotropic index (the ratio of the viscosityof 2 rpm to the viscosity of 20 rpm at 25 DEG C) is 1 .1-2.0.

Description

電極形成用樹脂組合物與晶片型電子零件及其製造方法Resin composition for electrode formation, chip-type electronic part and manufacturing method thereof

本發明係關於一種電極形成用樹脂組合物與使用該電極形成用樹脂組合物形成電極之晶片型電子零件及其製造方法。 本發明尤其是關於一種形成表面安裝用晶片型電子零件之外部電極之電極形成用樹脂組合物、使用其之晶片型電子零件及其製造方法。The present invention relates to a resin composition for forming an electrode, a wafer-type electronic component using the resin composition for forming an electrode to form an electrode, and a manufacturing method thereof. The present invention particularly relates to a resin composition for forming an electrode for forming an external electrode of a chip-type electronic component for surface mounting, a chip-type electronic component using the resin composition, and a manufacturing method thereof.

晶片電感器、晶片電阻、晶片型積層陶瓷電容器、晶片熱敏電阻等晶片型電子零件主要具備:包含陶瓷燒結體之晶片狀坯體、設置於其內部之內部電極及以與該內部電極導通之方式設置於晶片狀坯體之兩端面之外部電極,藉由將該外部電極焊接於基板而進行安裝。Chip-type electronic components such as chip inductors, chip resistors, chip-type multilayer ceramic capacitors, and chip thermistors mainly include: a chip-shaped body including a ceramic sintered body, an internal electrode arranged in the internal electrode, and a connection with the internal electrode The external electrodes provided on both ends of the wafer-shaped blank are mounted by welding the external electrodes to the substrate.

一般,外部電極係於利用密封樹脂成形之晶片之表面塗佈樹脂漿料之後,使其硬化而形成基底電極,進而進行鍍覆處理而形成。Generally, the external electrode is formed by coating a resin slurry on the surface of a wafer molded with a sealing resin, hardening it to form a base electrode, and then performing a plating process.

於第一端部之形成電極之部分利用浸漬法塗佈樹脂漿料並進行預乾燥而形成外部電極。其次,於形成第二電極之部分利用浸漬法塗佈樹脂漿料並進行預乾燥而形成外部電極。藉由預乾燥而開始燒結低溫活性之銀微粒子,藉此形成外部電極之外形形狀。其後,進而進行加熱,藉此使熱硬化性樹脂成分硬化,形成成為鍍覆處理之基底之外部電極。The part where the electrode is formed at the first end is coated with a resin slurry by a dipping method and pre-dried to form an external electrode. Next, a resin slurry is applied to the part where the second electrode is formed by a dipping method and pre-dried to form an external electrode. The low-temperature active silver particles are sintered by pre-drying, thereby forming the outer shape of the external electrode. After that, heating is further performed to harden the thermosetting resin component to form an external electrode that becomes the base of the plating process.

於此種晶片型電子零件中,外部電極用於連接晶片型電子零件與基板上之電路,故其良好與否對製品之電氣特性、可靠性、機械特性等產生較大影響。In this chip-type electronic component, the external electrode is used to connect the chip-type electronic component with the circuit on the substrate, so its goodness has a greater impact on the electrical characteristics, reliability, and mechanical characteristics of the product.

近來,各種製品之電子化持續發展,車載製品中亦搭載有許多晶片型電子零件,對於該等電子零件,亦要求較此前更高之耐環境性能及高可靠性。具體而言,要求於耐環境性試驗中電阻值之變化率小而穩定之電子零件。Recently, the electronicization of various products continues to develop, and many chip-type electronic components are also mounted in automotive products. For these electronic components, higher environmental resistance and high reliability are required than before. Specifically, electronic parts with a small and stable resistance value change rate in an environmental resistance test are required.

因此,對於電極形成用之樹脂漿料,亦要求接著性、耐濕處理後之電阻之穩定性優異之漿料。Therefore, the resin paste used for electrode formation is also required to have excellent adhesion and resistance stability after humidity treatment.

例如,專利文獻1中揭示有使混練Ag等金屬粉末與玻璃料等無機結合材料及有機媒劑而成之樹脂漿料中之金屬粉末燒結而形成基底電極的方法。專利文獻2中揭示有使用分散有環氧樹脂等熱硬化性樹脂與Ag等金屬粒子之樹脂漿料形成基底電極之方法。For example, Patent Document 1 discloses a method of sintering the metal powder in a resin paste formed by kneading a metal powder such as Ag with an inorganic bonding material such as glass frit and an organic vehicle to form a base electrode. Patent Document 2 discloses a method of forming a base electrode using a resin slurry in which a thermosetting resin such as epoxy resin and metal particles such as Ag are dispersed.

然而,專利文獻1之方法中,由於需要進行600℃以上之高溫下之熱處理,故有密封材中之樹脂或導線之自熔性之覆膜等劣化之虞。專利文獻2之方法中,若進行耐濕試驗,則有坯體與外部電極之接著強度劣化,外部電極剝離之虞。However, in the method of Patent Document 1, since a heat treatment at a high temperature of 600° C. or higher is required, the resin in the sealing material or the self-melting film of the wire may be deteriorated. In the method of Patent Document 2, if the moisture resistance test is performed, the bonding strength between the green body and the external electrode may deteriorate and the external electrode may peel off.

因此,揭示有使用包含燒結溫度為250℃以下之金屬微粒子之樹脂漿料,於250℃以下之低溫下焙燒之方法(專利文獻3)。 [先前技術文獻] [專利文獻]Therefore, there is disclosed a method of using a resin slurry containing metal fine particles with a sintering temperature of 250°C or less and firing at a low temperature of 250°C or less (Patent Document 3). [Prior Technical Literature] [Patent Literature]

[專利文獻1]日本專利特開平10-284343號公報 [專利文獻2]日本專利特開2005-116708號公報 [專利文獻3]日本專利特開2014-225590號公報[Patent Document 1] Japanese Patent Laid-Open No. 10-284343 [Patent Document 2] Japanese Patent Laid-Open No. 2005-116708 [Patent Document 3] Japanese Patent Laid-Open No. 2014-225590

[發明所欲解決之問題][The problem to be solved by the invention]

然而,若只單純使用包含金屬微粒子之樹脂漿料,則不僅體積電阻值較高,而且有稜角或針孔等塗佈外觀上之缺陷,或有於耐吸濕性試驗、耐高溫放置試驗等耐環境性試驗中無法對高要求級別(例如,電阻值之變化率為10%以內等)獲得充分之可靠性之虞。However, if only the resin paste containing metal particles is used, not only the volume resistance value is high, but also there are defects in the coating appearance such as corners or pinholes, or it is suitable for moisture absorption resistance test, high temperature resistance test, etc. In the environmental test, it may not be possible to obtain sufficient reliability for the high level (for example, the change rate of the resistance value is within 10%, etc.).

因此,本發明提供一種接著性、耐濕性、耐熱處理後之電阻之穩定性等優異並且塗佈外觀優異的低溫燒結型之電極形成用樹脂組合物。該電極形成用樹脂組合物亦可應用於車載級別之耐環境性能(超耐濕性、超耐熱性)。 [解決問題之技術手段]Therefore, the present invention provides a low-temperature sintering type electrode-forming resin composition having excellent adhesion, moisture resistance, resistance stability after heat treatment, etc., and excellent coating appearance. The resin composition for electrode formation can also be applied to automotive-grade environmental resistance (super moisture resistance, super heat resistance). [Technical means to solve the problem]

本發明發現,藉由將電極形成用樹脂組合物中用作熱硬化性樹脂之樹脂設為組合有特定之樹脂者,而滿足車載級別之耐環境性能,從而完成本發明。The present invention has discovered that the resin used as the thermosetting resin in the resin composition for electrode formation is combined with a specific resin to satisfy the environmental resistance performance of the vehicle level, thereby completing the present invention.

即,本發明之電極形成用樹脂組合物之一態樣之特徵在於:其係包含(A)熱硬化性樹脂、(B)自由基起始劑、(C)厚度或短徑為1~200 nm之銀微粒子及(D)除上述(C)成分以外之平均粒徑為2~20 μm之銀粉者,且其觸變比(25℃下之2 rpm之黏度與20 rpm之黏度之比率)為1.1~2.0。That is, one aspect of the resin composition for forming an electrode of the present invention is characterized in that it contains (A) a thermosetting resin, (B) a radical initiator, and (C) a thickness or short diameter of 1 to 200 nm silver particles and (D) silver powder with an average particle size of 2-20 μm other than the above-mentioned (C) component, and its thixotropic ratio (the ratio of the viscosity at 25°C at 2 rpm to the viscosity at 20 rpm) It is 1.1 to 2.0.

又,本發明之一態樣中,上述(A)熱硬化性樹脂可為(A1)具有羥基之(甲基)丙烯酸酯化合物或(甲基)丙烯醯胺化合物、(A2)常溫下為液狀之雙馬來醯亞胺樹脂、(A3)聚丁二烯。進而,可包含碳數5~10之支鏈狀二醇作為(E)溶劑。In addition, in one aspect of the present invention, the (A) thermosetting resin may be (A1) a (meth)acrylate compound or (meth)acrylamide compound having a hydroxyl group, and (A2) a liquid at room temperature. Shaped bismaleimide resin, (A3) polybutadiene. Furthermore, a branched diol having 5 to 10 carbon atoms may be included as the (E) solvent.

又,本發明之一態樣中,對於硬化後產物,1%重量減少溫度可為280℃以上400℃以下,下限可為320℃以上,下限可為340℃以上,下限亦可為350℃以上。 若1%重量減少溫度為該範圍,則獲得於耐吸濕性試驗、耐高溫放置試驗中電阻值之變化率小而穩定之電極形成用樹脂組合物。 1%重量減少溫度例如可藉由調整電極形成用樹脂組合物中所含之成分之種類、調配比率而控制。 於本實施形態中,例如於使電極形成用樹脂組合物10 mg於200℃下硬化1小時之後,於氮氣氛圍或空氣氛圍、升溫速度10℃/分鐘之條件下,進行TG/DTA(熱重量/示差熱分析)測定,藉此,可測定電極形成用樹脂組合物之1%重量減少溫度。Furthermore, in one aspect of the present invention, for the cured product, the 1% weight reduction temperature may be 280°C or higher and 400°C or lower, the lower limit may be 320°C or higher, the lower limit may be 340°C or higher, and the lower limit may be 350°C or higher . If the 1% weight loss temperature is in this range, a resin composition for electrode formation with a small and stable change rate of the resistance value in the moisture absorption resistance test and the high temperature standing test is obtained. The 1% weight reduction temperature can be controlled, for example, by adjusting the types and blending ratios of components contained in the resin composition for forming electrodes. In this embodiment, for example, after curing 10 mg of the resin composition for electrode formation at 200°C for 1 hour, TG/DTA (thermogravity) is performed in a nitrogen or air atmosphere at a temperature increase rate of 10°C/min. /Differential thermal analysis) measurement, whereby the 1% weight loss temperature of the resin composition for electrode formation can be measured.

本發明之晶片型電子零件之一態樣係具有包含陶瓷燒結體之長方體形狀之晶片型電子零件坯體的晶片型電子零件。進而,形成於上述晶片型電子零件坯體之內部之內部電極及形成於上述晶片型電子零件坯體之端面之外部電極之至少1個為上述電極形成用樹脂組合物之燒結體。One aspect of the chip-type electronic component of the present invention is a chip-type electronic component having a cuboid-shaped chip-type electronic component body including a ceramic sintered body. Furthermore, at least one of the internal electrode formed inside the chip-type electronic component body and the external electrode formed on the end surface of the chip-type electronic component body is a sintered body of the resin composition for forming the electrode.

本發明之晶片型電子零件之製造方法之一態樣係於陶瓷層之表面上使用上述電極形成用樹脂組合物藉由印刷而形成特定之電極圖案層。本發明之晶片型電子零件之製造方法之下一步驟係於該電極圖案層之上載置其他陶瓷層,並於該其他陶瓷層之表面上使用上述電極形成用樹脂組合物藉由印刷而形成特定之電極圖案層,反覆進行該操作,使陶瓷層與電極圖案層交替地積層。本發明之晶片型電子零件之製造方法之最後之步驟係燒結獲得之積層體,藉此製成具有藉由上述電極圖案形成之內部電極之晶片型電子零件坯體,並且於該晶片型電子零件坯體之端面形成外部電極。One aspect of the method for manufacturing a wafer-type electronic component of the present invention is to form a specific electrode pattern layer by printing using the resin composition for electrode formation on the surface of a ceramic layer. The next step of the method for manufacturing a wafer-type electronic component of the present invention is to place another ceramic layer on the electrode pattern layer, and use the resin composition for electrode formation on the surface of the other ceramic layer to form a specific For the electrode pattern layer, this operation is repeated to make the ceramic layer and the electrode pattern layer alternately stacked. The final step of the manufacturing method of the chip-type electronic component of the present invention is to sinter the laminated body, thereby forming a chip-type electronic component body having internal electrodes formed by the above-mentioned electrode pattern, and use the chip-type electronic component The end surface of the blank forms an external electrode.

本發明之晶片型電子零件之製造方法之一態樣係將上述電極形成用樹脂組合物藉由印刷或浸漬而塗佈於晶片型電子零件坯體之端面,並且燒結所塗佈之該電極形成用樹脂組合物,藉此形成外部電極。 [發明之效果]One aspect of the method for manufacturing a wafer-type electronic component of the present invention is to apply the resin composition for electrode formation to the end surface of a wafer-type electronic component body by printing or dipping, and sinter the coated electrode to form The resin composition is used to thereby form the external electrode. [Effects of Invention]

本發明之電極形成用樹脂組合物於耐吸濕性試驗、耐高溫放置試驗中電阻值之變化率較小。進而,由於調配有銀微粒子,故可於低溫下燒結,獲得之燒結體適於形成電子零件之電極。The resin composition for forming an electrode of the present invention has a small resistance value change rate in the moisture absorption resistance test and the high temperature standing test. Furthermore, since silver particles are prepared, it can be sintered at a low temperature, and the obtained sintered body is suitable for forming electrodes of electronic parts.

又,根據本發明之晶片型電子零件及其製造方法,由於使用上述電極形成用樹脂組合物形成電極,故可獲得具有高濕及高熱環境下向坯體之固著強度亦較強之電極之晶片型電子零件,成為可靠性較高之製品。In addition, according to the chip-type electronic component and the manufacturing method thereof of the present invention, since the electrode is formed using the resin composition for forming an electrode, it is possible to obtain an electrode with a strong fixation strength to the green body under a high humidity and high heat environment. Chip-type electronic parts have become highly reliable products.

本發明之電極形成用樹脂組合物之一態樣包含上述構成,以下,對本發明參照一實施形態之電極形成用樹脂組合物進行說明。One aspect of the resin composition for forming an electrode of the present invention includes the above-mentioned constitution. Hereinafter, the resin composition for forming an electrode according to an embodiment of the present invention will be described.

本實施形態中使用之(A)熱硬化性樹脂無特別限制,可將複數種特定之熱硬化性樹脂組合使用。作為該(A)熱硬化性樹脂中使用之樹脂,可為(A1)具有羥基之(甲基)丙烯酸酯化合物或(甲基)丙烯醯胺化合物、(A2)常溫下為液狀且主鏈具有脂肪族烴基之雙馬來醯亞胺樹脂及(A3)聚丁二烯樹脂。The (A) thermosetting resin used in this embodiment is not particularly limited, and a plurality of specific thermosetting resins can be used in combination. As the resin used in the (A) thermosetting resin, (A1) a (meth)acrylate compound having a hydroxyl group or a (meth)acrylamide compound, (A2) a liquid and a main chain at room temperature Bismaleimide resin with aliphatic hydrocarbon group and (A3) polybutadiene resin.

本實施形態中使用之(A1)具有羥基之(甲基)丙烯酸酯化合物或(甲基)丙烯醯胺化合物分別為1分子中具有1個以上(甲基)丙烯醯基之(甲基)丙烯酸酯或(甲基)丙烯醯胺,且含有羥基。The (A1) (meth)acrylic acid ester compound or (meth)acrylamide compound having a hydroxyl group used in this embodiment is (meth)acrylic acid having one or more (meth)acrylic groups in one molecule. Ester or (meth)acrylamide, and contains a hydroxyl group.

此處,具有羥基之(甲基)丙烯酸酯可藉由使多元醇化合物與(甲基)丙烯酸或其衍生物反應而獲得。該反應可使用公知之化學反應。具有羥基之(甲基)丙烯酸酯相對於多元醇化合物,通常使用0.5~5倍莫耳之丙烯酸酯或丙烯酸。Here, the (meth)acrylate having a hydroxyl group can be obtained by reacting a polyol compound with (meth)acrylic acid or a derivative thereof. A known chemical reaction can be used for this reaction. The (meth)acrylate having a hydroxyl group is usually 0.5 to 5 times moles of acrylate or acrylic with respect to the polyol compound.

又,具有羥基之(甲基)丙烯醯胺可藉由使具有羥基之胺化合物與(甲基)丙烯酸或其衍生物反應而獲得。使(甲基)丙烯酸酯與胺化合物反應而製造(甲基)丙烯醯胺類之方法一般由於(甲基)丙烯酸酯之雙鍵極富反應性,故預先於雙鍵上附加胺、環戊二烯、醇等作為保護基,醯胺化結束後進行加熱使保護基脫離。In addition, (meth)acrylamide having a hydroxyl group can be obtained by reacting an amine compound having a hydroxyl group with (meth)acrylic acid or a derivative thereof. The method for producing (meth)acrylamides by reacting (meth)acrylate and amine compound is generally because the double bond of (meth)acrylate is extremely reactive, so amine and cyclopentyl are added to the double bond in advance. Diene, alcohol, etc. are used as protecting groups, and heating is performed after the completion of amination to remove the protecting groups.

並且,藉由使該(甲基)丙烯酸酯化合物或(甲基)丙烯醯胺化合物含有羥基,而於形成電極時,藉由還原效應而促進燒結性,且提昇接著性。In addition, by allowing the (meth)acrylate compound or (meth)acrylamide compound to contain a hydroxyl group, when an electrode is formed, sinterability is promoted by a reduction effect, and adhesiveness is improved.

又,此處所說之羥基係脂肪族烴基之氫原子被取代之醇性之基。該羥基之含量可為1分子中1至50個,若羥基之含量為該範圍,則不存在由硬化過度導致之燒結性之阻礙,可促進燒結性。In addition, the hydroxyl group referred to herein is an alcoholic group in which the hydrogen atom of the aliphatic hydrocarbon group is substituted. The content of the hydroxyl group can be 1 to 50 per molecule. If the content of the hydroxyl group is within this range, there is no hindrance to the sinterability caused by excessive hardening, and the sinterability can be promoted.

作為此種(A1)具有羥基之(甲基)丙烯酸酯化合物或(甲基)丙烯醯胺化合物,例如可列舉以下通式(1)~(4)所表示之化合物。As such a (meth)acrylate compound or (meth)acrylamide compound which has a hydroxyl group (A1), the compound represented by the following general formula (1)-(4) is mentioned, for example.

[化1]

Figure 02_image001
(式中,R1 表示氫原子或甲基,R2 表示碳數1~100之2價之脂肪族烴基或具有環狀結構之脂肪族烴基)[化1]
Figure 02_image001
(In the formula, R 1 represents a hydrogen atom or a methyl group, and R 2 represents a divalent aliphatic hydrocarbon group having 1 to 100 carbon atoms or an aliphatic hydrocarbon group having a cyclic structure)

[化2]

Figure 02_image003
(式中,R1 及R2 分別表示與上述相同者)[化2]
Figure 02_image003
(In the formula, R 1 and R 2 respectively represent the same as above)

[化3]

Figure 02_image005
(式中,R1 表示與上述相同者,n表示1~50之整數)[化3]
Figure 02_image005
(In the formula, R 1 represents the same as above, and n represents an integer of 1-50)

[化4]

Figure 02_image007
(式中,R1 及n分別表示與上述相同者)[化4]
Figure 02_image007
(In the formula, R 1 and n respectively represent the same as above)

作為該(A1)(甲基)丙烯酸酯化合物或(甲基)丙烯醯胺化合物,可將上述通式(1)~(4)所表示之化合物單獨使用或組合2種以上使用。再者,通式(1)及(2)中之R2 之碳數可為1~100,亦可為1~36。若R2 之碳數為此種範圍,則不會因硬化過度而阻礙燒結性。As this (A1) (meth)acrylate compound or (meth)acrylamide compound, the compound represented by the said general formula (1)-(4) can be used individually or in combination of 2 or more types. Furthermore, the carbon number of R 2 in the general formulae (1) and (2) may be 1-100, or 1-36. If the carbon number of R 2 is in this range, the sinterability will not be hindered by excessive hardening.

本實施形態中使用之(A2)常溫下為液狀且主鏈中具有脂肪族烴基之雙馬來醯亞胺樹脂係主鏈中具有碳數為1以上之脂肪族烴基,且該主鏈連結2個馬來醯亞胺基而構成者。此處,脂肪族烴基可為直鏈狀、支鏈狀及環狀之任一形態,碳數可為6以上,碳數可為12以上,碳數亦可為24以上。又,該脂肪族烴基能夠與馬來醯亞胺基直接或間接地鍵結,可與馬來醯亞胺基直接鍵結。(A2) The bismaleimide resin used in this embodiment is liquid at room temperature and has an aliphatic hydrocarbon group in the main chain. The main chain has an aliphatic hydrocarbon group with 1 or more carbons, and the main chain is connected It is composed of two maleimide groups. Here, the aliphatic hydrocarbon group may be in any form of linear, branched, and cyclic, and the carbon number may be 6 or more, the carbon number may be 12 or more, and the carbon number may be 24 or more. In addition, the aliphatic hydrocarbon group can be directly or indirectly bonded to the maleimide group, and may be directly bonded to the maleimide group.

該(A2)馬來醯亞胺樹脂可為以下通式(5)所表示之化合物 [化5]

Figure 02_image009
(式中,Q表示碳數6以上之2價之直鏈狀、支鏈狀或環狀之脂肪族烴基,P為選自O、CO、COO、CH2 、C(CH3 )2 、C(CF3 )2 、S、S2 、SO及SO2 之2價之原子或有機基、或包含至少1個以上該等原子或有機基之有機基,m表示1~10之整數)。The (A2) maleimide resin may be a compound represented by the following general formula (5) [化5]
Figure 02_image009
(In the formula, Q represents a bivalent linear, branched or cyclic aliphatic hydrocarbon group with 6 or more carbons, and P is selected from O, CO, COO, CH 2 , C(CH 3 ) 2 , C (CF 3 ) 2 , S, S 2 , SO and SO 2 divalent atoms or organic groups, or organic groups containing at least one of these atoms or organic groups, and m represents an integer of 1-10).

此處,P所表示之2價之原子可列舉O、S等,2價之有機基可列舉CO、COO、CH2 、C(CH3 )2 、C(CF3 )2 、S2 、SO、SO2 等、以及包含至少1個以上該等原子或有機基之有機基。作為包含上述之原子或有機基之有機基,可列舉具有碳數1~3之烴基、苯環、環式環、胺基甲酸酯鍵等者作為除上述以外之結構,作為該情形之P,可例示以下化學式所表示之基。Here, the divalent atom represented by P includes O, S, etc., and the divalent organic group includes CO, COO, CH 2 , C(CH 3 ) 2 , C(CF 3 ) 2 , S 2 , SO , SO 2 etc., and organic groups containing at least one of these atoms or organic groups. As the organic group containing the above-mentioned atom or organic group, one having a hydrocarbon group with 1 to 3 carbons, a benzene ring, a cyclic ring, a urethane bond, etc., as a structure other than the above, is used as P in this case , The group represented by the following chemical formula can be exemplified.

[化6]

Figure 02_image011
[化6]
Figure 02_image011

進而,(A2)馬來醯亞胺樹脂可為以下通式(6)所表示之常溫下為液狀之雙馬來醯亞胺樹脂。 [化7]

Figure 02_image013
(式中,R3 ~R6 表示碳數6以上之2價之直鏈狀、支鏈狀或環狀之脂肪族烴基) 再者,R3 ~R6 較佳為碳數6~20,較佳為6~12。Furthermore, (A2) the maleimide resin may be a bismaleimide resin that is liquid at room temperature represented by the following general formula (6). [化7]
Figure 02_image013
(In the formula, R 3 to R 6 represent a divalent linear, branched or cyclic aliphatic hydrocarbon group with 6 or more carbons.) Furthermore, R 3 to R 6 are preferably 6 to 20 carbons. Preferably it is 6-12.

於本實施形態中,使用主鏈具有脂肪族烴基之雙馬來醯亞胺樹脂作為(A2)雙馬來醯亞胺樹脂係獲得耐熱性優異並且低應力且吸濕後之熱時接著強度良好之電極形成用樹脂組合物之必要條件之一。為了有效地獲得該特性,較佳為使用如上述通式(5)所表示之利用脂肪族烴基延長醯亞胺且室溫下為液狀之雙馬來醯亞胺樹脂作為(A2)成分。In this embodiment, a bismaleimide resin with an aliphatic hydrocarbon group in the main chain is used as the (A2) bismaleimide resin to obtain excellent heat resistance, low stress, and good adhesive strength after moisture absorption. One of the necessary conditions for the resin composition for electrode formation. In order to effectively obtain this characteristic, it is preferable to use as the component (A2) a bismaleimide resin that utilizes an aliphatic hydrocarbon group to extend the imine and is liquid at room temperature as represented by the general formula (5).

該(A2)雙馬來醯亞胺樹脂利用聚苯乙烯換算所得之數量平均分子量可為500以上10000以下,亦可為500以上5000以下。若數量平均分子量為該範圍,則耐吸濕性優異,可提高加熱時之接著強度。若數量平均分子量未達500,則可撓性降低,且耐熱性亦降低。若數量平均分子量超過10000,則有製備組合物時之作業性、使用時之作業性降低之傾向。The number average molecular weight of the (A2) bismaleimide resin converted from polystyrene may be 500 or more and 10,000 or less, or 500 or more and 5,000 or less. If the number average molecular weight is in this range, the moisture absorption resistance is excellent, and the adhesive strength during heating can be improved. If the number average molecular weight is less than 500, flexibility is reduced, and heat resistance is also reduced. If the number average molecular weight exceeds 10,000, the workability during the preparation of the composition and the workability during use tend to decrease.

本實施形態中使用之(A3)聚丁二烯係使1,3-丁二烯聚合而獲得之聚合物,亦包含其一部分經改性之化合物。作為該(A3)聚丁二烯,可為(A31)聚丁二烯經環氧改性之化合物、或(A32)末端具有(甲基)丙烯醯基之聚丁二烯聚合物。The (A3) polybutadiene used in this embodiment is a polymer obtained by polymerizing 1,3-butadiene, and also includes a modified compound. The (A3) polybutadiene may be (A31) epoxy-modified compound of polybutadiene, or (A32) polybutadiene polymer having a (meth)acryloyl group at the end.

(A31)聚丁二烯經環氧改性之化合物可為環氧當量為50~500(g/eq)之環氧化聚丁二烯。若環氧當量未達50,則有黏度增大,樹脂組合物之作業性降低之傾向,若超過500,則有熱時之接著強度降低之傾向。再者,環氧當量係藉由過氯酸法而求出。作為該環氧化聚丁二烯,可使用分子內具有羥基者。 作為環氧化聚丁二烯,例如,可使用由Daicel股份有限公司市售之Epolead PB4700及GT401(均為商品名)、由日本曹達股份有限公司市售之JP-100及JP-200(均為商品名)。(A31) The epoxy-modified compound of polybutadiene can be epoxidized polybutadiene with an epoxy equivalent of 50 to 500 (g/eq). If the epoxy equivalent is less than 50, the viscosity will increase and the workability of the resin composition will tend to decrease. If it exceeds 500, the adhesive strength will tend to decrease when heated. In addition, epoxy equivalent is calculated|required by perchloric acid method. As the epoxidized polybutadiene, one having a hydroxyl group in the molecule can be used. As the epoxidized polybutadiene, for example, Epolead PB4700 and GT401 (both trade names) commercially available by Daicel Co., Ltd., and JP-100 and JP-200 (both Product name).

(A32)末端具有(甲基)丙烯醯基之聚丁二烯聚合物可藉由使分子末端導入有羥基之聚丁二烯聚合物與異氰酸2-(甲基)丙烯醯氧基乙酯等進行胺基甲酸酯化反應而獲得。或,亦可於使分子末端導入有羥基之聚丁二烯聚合物與六亞甲基二異氰酸酯等二異氰酸酯反應之後,與(甲基)丙烯酸反應而獲得。(A32) The polybutadiene polymer having a (meth)acryloyl group at the end can be obtained by introducing a polybutadiene polymer with a hydroxyl group at the molecular end and isocyanate 2-(meth)acryloyloxyethylene Ester etc. are obtained by carrying out a urethane reaction. Alternatively, it can be obtained by reacting a polybutadiene polymer with a hydroxyl group introduced into the molecular terminal with a diisocyanate such as hexamethylene diisocyanate, and then reacting with (meth)acrylic acid.

作為末端具有(甲基)丙烯醯基之聚丁二烯聚合物,例如可使用由大阪有機化學工業市售之BAC-15、BAC-45、SPBDA-S30(均為商品名)、由日本曹達股份有限公司市售之TE-2000、TEAI-1000、GI-3000(均為商品名)。 藉由包含該(A3)聚丁二烯,電極形成用樹脂組合物可提昇電極對於晶片零件端子之接著性。As a polybutadiene polymer having a (meth)acryloyl group at the end, for example, BAC-15, BAC-45, SPBDA-S30 (all trade names) commercially available from Osaka Organic Chemical Industry, and Nippon Soda TE-2000, TEAI-1000, GI-3000 (all trade names) commercially available from Co., Ltd. By including this (A3) polybutadiene, the resin composition for electrode formation can improve the adhesion of the electrode to the chip component terminal.

該(A3)聚丁二烯可為數量平均分子量為500~10000者。若分子量為該範圍,則接著性良好,可控制為合適之黏度,故作業性變良好。數量平均分子量係藉由凝膠滲透層析法利用標準聚苯乙烯之校準曲線測定(以下稱為GPC法)之值。The (A3) polybutadiene may have a number average molecular weight of 500 to 10,000. If the molecular weight is in this range, the adhesiveness is good and the viscosity can be controlled to an appropriate viscosity, so workability becomes good. The number average molecular weight is a value determined by gel permeation chromatography using a calibration curve of standard polystyrene (hereinafter referred to as GPC method).

並且,可如下所述以特定之量調配上述說明之(A1)~(A3)之各成分,製成(A)熱硬化性樹脂。 即,本實施形態中使用之(A)熱硬化性樹脂於將(A)熱硬化性樹脂設為100質量%時,(A1)具有羥基之(甲基)丙烯酸酯化合物或(甲基)丙烯醯胺化合物為0~75質量%、(A2)常溫下為液狀且主鏈具有脂肪族烴基之雙馬來醯亞胺樹脂為10~90質量%、(A3)環氧化聚丁二烯為10~90質量%。In addition, the components (A1) to (A3) described above can be blended in specific amounts as described below to prepare (A) thermosetting resin. That is, (A) thermosetting resin used in this embodiment, when (A) thermosetting resin is 100% by mass, (A1) a (meth)acrylate compound having a hydroxyl group or (meth)acrylic acid The amide compound is 0 to 75% by mass, (A2) the bismaleimide resin that is liquid at room temperature and has an aliphatic hydrocarbon group in the main chain is 10 to 90% by mass, and (A3) the epoxidized polybutadiene is 10 to 90% by mass.

進而,(A1)具有羥基之(甲基)丙烯酸酯化合物或(甲基)丙烯醯胺化合物可為0~50質量%。 進而,(A1)具有羥基之(甲基)丙烯酸酯化合物或(甲基)丙烯醯胺化合物可為20質量%以下,亦可為0質量%。於(A1)具有羥基之(甲基)丙烯酸酯化合物或(甲基)丙烯醯胺化合物為0質量%之情形時,(A2)常溫下為液狀且主鏈具有脂肪族烴基之雙馬來醯亞胺樹脂之調配量相對於(A3)環氧化聚丁二烯之調配量之比[(A2)/(A3)]可為1以上。 若(A1)~(A3)之各成分為該範圍內,則耐熱性、耐濕性及接著性良好,尤其可用於耐吸濕性試驗、耐高溫放置試驗等耐環境性之要求級別較高之車載用途。Furthermore, (A1) the (meth)acrylate compound or (meth)acrylamide compound which has a hydroxyl group may be 0-50 mass %. Furthermore, (A1) the (meth)acrylate compound or (meth)acrylamide compound which has a hydroxyl group may be 20 mass% or less, and may be 0 mass %. When (A1) a (meth)acrylate compound having a hydroxyl group or a (meth)acrylamide compound is 0% by mass, (A2) a bismaleic compound that is liquid at room temperature and has an aliphatic hydrocarbon group in the main chain The ratio [(A2)/(A3)] of the blending amount of the imine resin to the blending amount of (A3) epoxidized polybutadiene may be 1 or more. If the components of (A1)~(A3) are within this range, the heat resistance, moisture resistance and adhesion are good, and it can be used especially for moisture absorption resistance test, high temperature resistance test and other environmental resistance requirements with higher levels For vehicle use.

若(A1)成分之調配量多於75質量%,則有電極形成用樹脂組合物之耐熱性、耐濕性較差之虞。若(A2)成分之調配量少於10質量%,則有電極形成用樹脂組合物之耐熱性、耐濕性較差之虞,若多於90質量%,則有電極形成用樹脂組合物之接著強度較差之虞。又,若(A3)成分之調配量少於10質量%,則有電極形成用樹脂組合物之接著強度較差之虞,若多於90質量%,則有容易殘留電極形成用樹脂組合物之未反應成分而接著強度較差之虞。If the blending amount of the (A1) component is more than 75% by mass, the resin composition for electrode formation may have poor heat resistance and moisture resistance. If the blending amount of component (A2) is less than 10% by mass, the resin composition for electrode formation may have poor heat resistance and moisture resistance. If it is more than 90% by mass, the resin composition for electrode formation may be bonded Poor strength. In addition, if the blending amount of component (A3) is less than 10% by mass, the adhesive strength of the resin composition for electrode formation may be inferior. If it is more than 90% by mass, the resin composition for electrode formation may easily remain. There is a concern that the strength of the reaction component is poor.

再者,作為該(A)熱硬化性樹脂,亦可使用除上述(A1)~(A3)成分以外之熱硬化性樹脂,此處可使用之熱硬化性樹脂例如可列舉:環氧樹脂、雙馬來醯亞胺樹脂、聚丁二烯樹脂、酚樹脂等。其中,於將(A)熱硬化性樹脂設為100質量%時,除(A1)~(A3)成分以外之熱硬化性樹脂可為20質量%以下,亦可為10質量%以下。In addition, as the (A) thermosetting resin, thermosetting resins other than the above-mentioned (A1) to (A3) components may also be used. Examples of thermosetting resins that can be used here include epoxy resins, Bismaleimide resin, polybutadiene resin, phenol resin, etc. However, when the (A) thermosetting resin is 100% by mass, the thermosetting resin other than the components (A1) to (A3) may be 20% by mass or less, or 10% by mass or less.

本實施形態中使用之(B)自由基起始劑只要為通常自由基聚合中使用之聚合觸媒,則可無特別限制地使用。The (B) radical initiator used in this embodiment can be used without particular limitation as long as it is a polymerization catalyst generally used in radical polymerization.

作為該(B)自由基起始劑,可為快速加熱試驗(將試樣1 g置於電熱板之上,以4℃/分鐘進行升溫時之分解開始溫度之測定試驗)中之分解開始溫度成為40~140℃者。若分解開始溫度未達40℃,則有接著性熱硬化性型樹脂組合物之常溫下之保存性變得不良之虞,若超過140℃,則存在硬化時間變得極長之可能性。再者,上述分解開始溫度可將相對於加熱試樣前之質量減少1%質量時之溫度設為分解開始溫度。As the (B) radical initiator, it can be the decomposition start temperature in the rapid heating test (place 1 g of the sample on the electric heating plate, and conduct the decomposition start temperature measurement test at 4°C/min.) Be 40~140℃. If the decomposition start temperature is less than 40°C, the storage property at room temperature of the adhesive thermosetting resin composition may become poor. If it exceeds 140°C, the curing time may become extremely long. Furthermore, the decomposition start temperature may be the temperature at which the mass is reduced by 1% from the mass before heating the sample as the decomposition start temperature.

作為滿足該條件之自由基起始劑之具體例,例如可列舉:1,1-雙(第三丁基過氧基)-2-甲基環己烷、過氧化新癸酸第三丁酯、過氧化二異丙苯等。該等可單獨使用,亦可為了控制硬化性而混合2種以上使用。Specific examples of free radical initiators satisfying this condition include, for example, 1,1-bis(tert-butylperoxy)-2-methylcyclohexane and tert-butyl peroxyneodecanoate , Dicumyl peroxide, etc. These may be used alone, or two or more of them may be mixed and used for curability control.

相對於上述(A)熱硬化性樹脂100質量份,該(B)自由基起始劑之調配量可為0.1~10質量份。若該調配量超過10質量份,則有樹脂組合物之黏度之經時變化變大而作業性降低之虞,若未達0.1質量份,則有硬化性顯著降低之可能性。The compounding amount of the (B) radical initiator may be 0.1-10 parts by mass relative to 100 parts by mass of the above-mentioned (A) thermosetting resin. If the blending amount exceeds 10 parts by mass, the viscosity of the resin composition may change over time and the workability may decrease. If it is less than 0.1 parts by mass, the curability may be significantly reduced.

本實施形態中使用之(C)銀微粒子只要為其厚度或短徑為1~200 nm之銀微粒子,則可無特別限制地使用。該(C)銀微粒子之形狀可列舉:板型、樹枝狀、棒狀、線狀、球狀等。此處,若為板型,則其厚度滿足上述範圍即可,又,若為樹枝狀、棒狀、線狀、球狀,則其剖面直徑中之最短徑滿足上述範圍即可。The (C) silver fine particles used in this embodiment can be used without particular limitation as long as they are silver fine particles with a thickness or a short diameter of 1 to 200 nm. Examples of the shape of the (C) silver fine particles include plate shape, dendritic shape, rod shape, linear shape, spherical shape, and the like. Here, if it is a plate shape, the thickness may satisfy the above-mentioned range, and if it is a dendritic, rod-like, linear, or spherical shape, the shortest diameter of the cross-sectional diameter may satisfy the above-mentioned range.

上述(C)銀微粒子可使用(C1)板型銀微粒子。該板型銀微粒子由於有於短徑方向上堆積之傾向,故有如下優點:於藉由浸漬塗佈使電極形成用樹脂組合物於電子零件之兩端成膜時,可獲得表面凹凸較少之平滑之電極面。For the above (C) silver fine particles, (C1) plate-type silver fine particles can be used. Since the plate-shaped silver particles tend to accumulate in the short-axis direction, they have the following advantages: when the electrode-forming resin composition is formed into a film on both ends of electronic parts by dip coating, less surface irregularities can be obtained The smooth electrode surface.

該板型銀微粒子之中心粒徑可為0.3~15 μm。本發明之一實施形態藉由將板型銀微粒子之中心粒徑設為該範圍,可提昇向樹脂成分之分散性。此處,中心粒徑係指利用雷射繞射式粒度分佈測定裝置測得之體積基準之粒度分佈曲線中之50%累計值(50%粒徑)。The central particle size of the plate-shaped silver particles can be 0.3-15 μm. In one embodiment of the present invention, by setting the center particle diameter of the plate-shaped silver fine particles within this range, the dispersibility to the resin component can be improved. Here, the central particle size refers to the 50% cumulative value (50% particle size) in the volume-based particle size distribution curve measured by a laser diffraction particle size distribution measuring device.

又,厚度為10~200 nm,進而可為10~100 nm。該厚度係藉由對利用穿透式電子顯微鏡(TEM)或掃描式電子顯微鏡(SEM)取得之觀察圖像進行資料處理而測定者。進而,該厚度之平均厚度可為上述範圍內。該平均厚度係以下述之方式作為個數平均厚度而算出。In addition, the thickness is 10 to 200 nm, and further may be 10 to 100 nm. The thickness is measured by data processing of observation images obtained by a transmission electron microscope (TEM) or a scanning electron microscope (SEM). Furthermore, the average thickness of the thickness may be within the above-mentioned range. The average thickness is calculated as the number average thickness in the following manner.

將根據[n+1]個(n+1例如為50至100左右)板型銀微粒子之觀察圖像測量之厚度由厚至薄依序排列,將該範圍(最大厚度:x1 、最小厚度:xn 1 )分割為n份,將各厚度之區間設為[xj 、xj 1 ](j=1、2、……、n)。該情形之分割成為對數標尺上之等分割。又,基於對數標尺,各厚度區間中之代表厚度由下述式表示。Arrange the thickness measured according to the observation image of [n+1] (n+1, for example, 50 to 100) plate-shaped silver particles in order from thick to thin, and the range (maximum thickness: x 1 , minimum thickness: x n + 1) is divided into n parts, the thickness of each segment is set to [x j, x j + 1 ] (j = 1,2, ......, n). The division in this case becomes equal division on the logarithmic scale. In addition, based on a logarithmic scale, the representative thickness in each thickness interval is represented by the following formula.

[數1]

Figure 02_image015
[Number 1]
Figure 02_image015

進而,若將rj (j=1、2、……、n)設為與區間[xj 、xj 1 ]對應之相對量(差量%),且將整個區間之合計設為100%,則對數標尺上之平均值μ可利用下述式計算。Further, when r j (j = 1,2, ...... , n) is set to the interval [x j, x j + 1 ] corresponding to the relative amount (% difference), and the total of the entire interval is 100 %, the average μ on the logarithmic scale can be calculated using the following formula.

[數2]

Figure 02_image017
[Number 2]
Figure 02_image017

該μ為對數標尺上之數值,不具有作為厚度之單位,故為了變回厚度之單位,計算10μ 即10之μ次方。該10μ 為個數平均厚度。The μ is a value on a logarithmic scale and does not have a unit of thickness, so in order to change back to a unit of thickness, calculate 10 μ , which is 10 to the power of μ. This 10 μ is the number average thickness.

又,與厚度方向垂直之方向之長邊可為厚度之8~150倍之範圍內,亦可為10~50倍。進而,與厚度方向垂直之方向之短邊可為厚度之1~100倍之範圍內,亦可為3~50倍。In addition, the long side in the direction perpendicular to the thickness direction may be in the range of 8 to 150 times the thickness, or 10 to 50 times. Furthermore, the short side in the direction perpendicular to the thickness direction may be in the range of 1 to 100 times the thickness, or 3 to 50 times.

該板型銀微粒子可於100~250℃下自燒結。藉由包含如此於100~250℃下自燒結之銀微粒子,熱硬化時銀微粒子之流動性提昇,其結果為,銀微粒子彼此之接點變得更多,且接點之面積變大,導電性明顯提昇。自燒結溫度越低則燒結性越良好,故板型銀微粒子之燒結溫度可為100~200℃。再者,此處可自燒結係指即使不加壓或不添加添加劑等,亦可利用低於熔點之溫度下之加熱而燒結。The plate-shaped silver particles can be self-sintered at 100-250°C. By including the silver particles self-sintered at 100-250°C, the fluidity of the silver particles is improved during thermal hardening. As a result, the contacts between the silver particles become more and the area of the contacts becomes larger. The sex is significantly improved. The lower the self-sintering temperature, the better the sinterability, so the sintering temperature of the plate-shaped silver particles can be 100-200°C. Furthermore, self-sintering here means that even if no pressure or additives are added, it can be sintered by heating at a temperature lower than the melting point.

作為此種板型銀微粒子,例如可列舉:Tokusen Kogyo股份有限公司製造之M612(商品名;中心粒徑6~12 μm、粒子厚度60~100 nm、熔點250℃)、M27(商品名;中心粒徑2~7 μm、粒子厚度60~100 nm、熔點200℃)、M13(商品名;中心粒徑1~3 μm、粒子厚度40~60 nm、熔點200℃)、N300(商品名;中心粒徑0.3~0.6 μm、粒子厚度50 nm以下、熔點150℃)等。該等板型銀微粒子可單獨使用,亦可組合使用。尤其是為了提昇填充率,板型銀微粒子例如可將上述板型銀微粒子中之M27、M13等相對較大之銀微粒子與N300等粒徑較小者組合使用。Examples of such plate-shaped silver microparticles include: M612 (trade name; center particle size 6-12 μm, particle thickness 60-100 nm, melting point 250°C) manufactured by Tokusen Kogyo Co., Ltd., M27 (trade name; center Particle size 2~7 μm, particle thickness 60~100 nm, melting point 200℃), M13 (trade name; center particle diameter 1~3 μm, particle thickness 40~60 nm, melting point 200℃), N300 (trade name; center The particle size is 0.3-0.6 μm, the particle thickness is 50 nm or less, and the melting point is 150°C). These plate-shaped silver particles can be used alone or in combination. Especially in order to increase the filling rate, the plate-shaped silver particles can be used in combination with relatively large silver particles such as M27 and M13 among the above-mentioned plate-shaped silver particles and smaller particles such as N300.

(C1)板型銀微粒子較佳為粒子厚度為200 nm以下、振實密度(TD)為3.0~7.0 g/cm3 、且比表面積(BET)為2.0~6.0 m2 /g。(C1) The plate-shaped silver fine particles preferably have a particle thickness of 200 nm or less, a tap density (TD) of 3.0 to 7.0 g/cm 3 , and a specific surface area (BET) of 2.0 to 6.0 m 2 /g.

上述(C)銀微粒子可使用(C2)球狀銀微粒子。本實施形態中使用之球狀銀微粒子之粒徑可為10~200 nm。該球狀銀微粒子通常可為銀微粒子之金屬表面設置有利用有機化合物形成之覆膜層者或使該銀微粒子分散於有機化合物中而成者。若設為此種形態,則含有之銀微粒子彼此能夠使其金屬面不直接接觸,故可減少形成銀微粒子凝聚之塊,可使銀微粒子保持為各自分散之狀態。再者,該粒徑係藉由對利用穿透式電子顯微鏡(TEM)或掃描式電子顯微鏡(SEM)而取得之觀察圖像進行資料處理而測定者。進而,(C2)球狀銀微粒子之平均粒徑可為上述範圍內。該平均粒徑係作為根據50個至100個球狀銀微粒子之觀察圖像而測量之粒徑之個數平均粒徑而算出。該個數平均粒徑只要與上述平均厚度之算出同樣地算出平均值即可。The (C) silver fine particles can be (C2) spherical silver fine particles. The particle size of the spherical silver particles used in this embodiment may be 10 to 200 nm. The spherical silver particles can generally be formed by providing a coating layer formed of an organic compound on the metal surface of the silver particles, or by dispersing the silver particles in an organic compound. In this form, the silver particles contained can make the metal surfaces not directly contact each other, so the aggregation of the silver particles can be reduced, and the silver particles can be kept in a dispersed state. Furthermore, the particle size is measured by data processing of observation images obtained by a transmission electron microscope (TEM) or a scanning electron microscope (SEM). Furthermore, the average particle diameter of (C2) spherical silver fine particles may be within the above-mentioned range. The average particle diameter is calculated as the number average particle diameter of the particle diameters measured from observation images of 50 to 100 spherical silver particles. The number average particle diameter may be calculated as the average value in the same manner as the calculation of the average thickness described above.

上述(C1)板狀銀微粒子與(C2)球狀銀微粒子可併用,於併用之情形時,其調配比可為100:0~10:90。若(C1)板狀銀微粒子與(C2)球狀銀微粒子之調配比為該範圍,則塗佈外觀及固著強度變良好。The aforementioned (C1) plate-shaped silver particles and (C2) spherical silver particles can be used in combination, and when used in combination, the blending ratio can be 100:0-10:90. If the blending ratio of (C1) plate-shaped silver microparticles and (C2) spherical silver microparticles is within this range, the coating appearance and fixing strength become good.

本實施形態中使用之(D)銀粉為除(C)成分以外之銀粉。 (D)銀粉之平均粒徑為0.2~20 μm,只要是作為為了賦予導電性而添加於樹脂接著劑中之無機填充材料之銀粉即可。於本實施形態中,(D)銀粉之振實密度可為2.0~7.0 g/cm3The (D) silver powder used in this embodiment is a silver powder other than the (C) component. (D) The average particle diameter of the silver powder is 0.2-20 μm, as long as it is a silver powder that is an inorganic filler added to the resin adhesive to impart conductivity. In this embodiment, the tap density of (D) silver powder can be 2.0-7.0 g/cm 3 .

藉由除上述(C)成分之銀微粒子以外添加此種(D)成分之銀粉,可進一步提昇晶片零件之端子與電極之接合強度。又,作為此處使用之銀粒子之形狀,例如可列舉:薄片狀、樹脂狀、棒狀、線狀、球狀、板狀等。再者,該(D)成分之銀粉之平均粒徑係指利用雷射繞射粒度分佈測定裝置測得之體積基準之粒度分佈曲線中之50%累計值(50%粒徑)。尤其是若使用(D1)薄片狀銀粉,則獲得良好之導通電阻。進而,(D)成分之銀粉可將(D1)薄片狀銀粉與(D2)球狀銀粉混合使用。(D1)薄片狀銀粉與(D2)球狀銀粉之調配比可為100:0~10:90。若(D1)薄片狀銀粉與(D2)球狀銀粉之調配比為該範圍,則固著強度與導通電阻變良好。By adding the silver powder of the component (D) in addition to the silver particles of the component (C), the bonding strength between the terminals of the chip parts and the electrodes can be further improved. In addition, as the shape of the silver particles used here, for example, a flake shape, a resin shape, a rod shape, a linear shape, a spherical shape, a plate shape, etc. can be mentioned. Furthermore, the average particle size of the silver powder of component (D) refers to the 50% cumulative value (50% particle size) in the volume-based particle size distribution curve measured by a laser diffraction particle size distribution measuring device. Especially if (D1) flaky silver powder is used, good on-resistance is obtained. Furthermore, the (D) component silver powder can be used by mixing (D1) flake-shaped silver powder and (D2) spherical silver powder. The mixing ratio of (D1) flaky silver powder and (D2) spherical silver powder can be 100:0-10:90. If the blending ratio of (D1) flaky silver powder and (D2) spherical silver powder is in this range, the fixation strength and on-resistance become good.

再者,關於該等(C)成分與(D)成分之比率,(C)成分:(D)成分之質量比可為10:90~50:50。若(C)成分相對於(D)成分之比率過少,則有燒結性降低,由此電阻值增加之虞,若過多,則有黏度大幅度增加,損害向電子零件之塗佈性之虞。Furthermore, regarding the ratio of the (C) component to the (D) component, the mass ratio of the (C) component: (D) component may be 10:90-50:50. If the ratio of the (C) component to the (D) component is too small, the sinterability may decrease and the resistance value may increase, and if it is too large, the viscosity may increase significantly and the coating properties to electronic parts may be impaired.

本實施形態之電極形成用樹脂組合物以上述(A)~(D)之各成分為必須成分,以此方式獲得之電極形成用樹脂組合物之觸變比(25℃下之2 rpm之黏度與20 rpm之黏度之比率)為1.1~2.0。該觸變比可為1.1~1.5,亦可為1.2~1.4。 若觸變比為1.1~2.0之範圍,則塗佈外觀優異並且接著性、耐濕性、耐熱處理後之電阻之穩定性等優異。另一方面,若觸變比未達1.1,則有於製造電子零件時之浸漬塗佈時因拉絲而導致作業性降低之虞,若觸變比超過2.0,則有於浸漬塗佈時產生稜角,用作電氣、電子零件之外部電極之情形時尺寸穩定性降低之虞,任一情形均有作為電子零件之良率變差之虞。The resin composition for electrode formation of this embodiment uses the above-mentioned components (A) to (D) as essential components. The thixotropic ratio of the resin composition for electrode formation obtained in this way (viscosity of 2 rpm at 25°C) The ratio of viscosity to 20 rpm) is 1.1 to 2.0. The thixotropic ratio can be 1.1 to 1.5, or 1.2 to 1.4. If the thixotropy ratio is in the range of 1.1 to 2.0, the coating appearance is excellent, and the adhesion, moisture resistance, and resistance of resistance after heat treatment are excellent. On the other hand, if the thixotropy ratio is less than 1.1, the workability may be reduced due to wire drawing during dip coating in the manufacture of electronic parts. If the thixotropy ratio exceeds 2.0, edges and corners may occur during dip coating. , When used as external electrodes of electric and electronic parts, the dimensional stability may decrease, and in either case, the yield rate of electronic parts may deteriorate.

於本實施形態中,電極成形用樹脂組合物中可進而包含黏度為200 cP以上之高黏度溶劑作為(E)溶劑。該(E)溶劑之黏度可為250 cP以上,亦可為300 cP以上。作為此種高黏度溶劑,例如,可為以烴骨架為主鏈之二醇,進而亦可為碳數5~10之支鏈狀二醇。再者,(E)溶劑之黏度可為600 cP以下,亦可為500 cP以下。 藉由含有此種(E)溶劑,容易調整為上述觸變比。In this embodiment, the resin composition for forming an electrode may further include a high-viscosity solvent having a viscosity of 200 cP or more as the (E) solvent. The viscosity of the (E) solvent can be 250 cP or more, or 300 cP or more. As such a high-viscosity solvent, for example, a diol having a hydrocarbon skeleton as the main chain may be used, and a branched diol having 5 to 10 carbon atoms may also be used. Furthermore, (E) the viscosity of the solvent can be 600 cP or less, or 500 cP or less. By containing this (E) solvent, it is easy to adjust to the said thixotropic ratio.

作為以上述烴骨架為主鏈之二醇,可無特別限制地使用各種公知者。作為此種二醇,只要為總碳數5~10之支鏈狀二醇即可,亦可為具有碳數1~4之烷基作為取代基之2-烷基-1,3-己二醇。作為分子鏈狀二醇之具體之化合物,例如可列舉:2-乙基-1,3-己二醇、2-丁基-2-乙基-1,3-丙二醇、2,4-二乙基-1,5-戊二醇、2,2,4-三甲基-1,3-戊二醇、2-甲基-1,8-辛二醇、新戊二醇等,可將該等併用2種以上。該等之中較佳為沸點140~260℃左右者。 尤其是較佳為選自由2-乙基-1,3-己二醇、2-丁基-2-乙基-1,3-丙二醇及2,4-二乙基-1,5-戊二醇所組成之群中之至少一種。 再者,關於上述具有碳數1~4之烷基作為取代基之2-烷基-1,3-己二醇,具體而言,作為烷基,可列舉甲基、乙基、丙基、異丙基、丁基、異丁基等。As the diol having the above-mentioned hydrocarbon skeleton as the main chain, various well-known ones can be used without particular limitation. As such a diol, as long as it is a branched diol having a total carbon number of 5-10, it may also be a 2-alkyl-1,3-hexanedi having an alkyl group with a carbon number of 1 to 4 as a substituent. alcohol. Specific compounds of molecular chain diols include, for example, 2-ethyl-1,3-hexanediol, 2-butyl-2-ethyl-1,3-propanediol, and 2,4-diethyl 1,5-pentanediol, 2,2,4-trimethyl-1,3-pentanediol, 2-methyl-1,8-octanediol, neopentyl glycol, etc., Use two or more kinds in combination. Among them, those having a boiling point of about 140 to 260°C are preferred. In particular, it is preferably selected from 2-ethyl-1,3-hexanediol, 2-butyl-2-ethyl-1,3-propanediol and 2,4-diethyl-1,5-pentane At least one of the group consisting of alcohol. Furthermore, regarding the above-mentioned 2-alkyl-1,3-hexanediol having an alkyl group having 1 to 4 carbon atoms as a substituent, specific examples of the alkyl group include methyl, ethyl, propyl, Isopropyl, butyl, isobutyl, etc.

例如,2-乙基-1,3-己二醇之20℃下之黏度為323 cP之高黏度。於通常之電極用漿料中,於使用此種高黏度之溶劑之情形時,若黏度過高,則有印刷性、作業性降低之虞。與此相對,若於本實施形態之電極用漿料中使用上述(E)溶劑,則即使以本實施形態中規定之濃度含有(C)銀微粒子與(D)銀粉,亦可獲得所需之觸變比,獲得塗佈外觀良好之電極。For example, the viscosity of 2-ethyl-1,3-hexanediol at 20°C is a high viscosity of 323 cP. In normal electrode pastes, when using such a high-viscosity solvent, if the viscosity is too high, the printability and workability may decrease. In contrast, if the above-mentioned (E) solvent is used in the electrode paste of this embodiment, even if (C) silver particles and (D) silver powder are contained in the concentration specified in this embodiment, the desired Thixotropy ratio, to obtain an electrode with good coating appearance.

進而,藉由使電極形成用樹脂組合物包含上述溶劑,而於電子零件之製造步驟中,於浸漬塗佈電極形成用樹脂組合物時藉由刮漿板使浸漬槽之表面平坦化時,電極形成用樹脂組合物之黏度變化率(增黏率)成為200%以下,連續作業性變良好。Furthermore, by making the resin composition for forming an electrode contain the above-mentioned solvent, when the resin composition for forming an electrode is dip-coated in the manufacturing step of an electronic component, the surface of the dip tank is flattened by a doctor blade. The viscosity change rate (thickness increase rate) of the resin composition for formation becomes 200% or less, and continuous workability becomes good.

本實施形態之電極形成用樹脂組合物可以如下比率調配上述之(A)~(D)成分,將該(A)~(D)成分之合計設為100質量%時,調配(A)熱硬化性樹脂1~15質量%、(C)銀微粒子5~40質量%、(D)銀粉50~90質量%、相對於(A)熱硬化性樹脂100質量份為0.1~10質量份之(B)自由基起始劑。又,於含有(E)溶劑之情形時,於將(A)~(D)成分之合計設為100質量份時,可以1~10質量份之含量含有(E)溶劑。藉由設為此種組成,耐熱性、耐濕性、接著性、及環境耐性變良好。The resin composition for electrode formation of this embodiment can be formulated with the above-mentioned components (A) to (D) in the following ratios, and when the total of the components (A) to (D) is 100% by mass, (A) thermosetting 1-15% by mass of (C) silver particles, 5-40% by mass, (D) 50-90% by mass of silver powder, 0.1-10 parts by mass relative to 100 parts by mass of (A) thermosetting resin (B ) Free radical initiator. In addition, when the (E) solvent is contained, when the total of the components (A) to (D) is 100 parts by mass, the (E) solvent may be contained in an amount of 1 to 10 parts by mass. With such a composition, heat resistance, moisture resistance, adhesiveness, and environmental resistance become better.

本實施形態之電極形成用樹脂組合物包含上述(A)~(D)各成分,除該等以外,亦可視需要適當調配以(E)溶劑為代表之此種樹脂組合物中一般調配之硬化促進劑、橡膠、矽酮等低應力化劑、偶合劑、密接賦予劑、鈦酸酯偶合劑、顏料、染料、消泡劑、界面活性劑、稀釋劑等添加劑。The resin composition for electrode formation of the present embodiment contains the above-mentioned components (A) to (D). In addition to these components, the resin composition represented by (E) solvent may be appropriately blended as required. Additives such as accelerators, rubber, silicone and other low-stress agents, coupling agents, adhesion imparting agents, titanate coupling agents, pigments, dyes, defoamers, surfactants, diluents, etc.

本實施形態之電極形成用樹脂組合物將上述(A)~(D)之各成分、及視需要調配之偶合劑等添加劑、(E)溶劑等充分地混合。 其次,本實施形態之電極形成用樹脂組合物係藉由分散機、捏合機、三輥研磨機等對經混合之樹脂組合物進行混練處理。最後,本實施形態之電極形成用樹脂組合物可藉由使經混練之樹脂組合物消泡而製備。The resin composition for electrode formation of this embodiment fully mixes each component of the said (A)-(D), additives, such as a coupling agent, if necessary, (E) a solvent, etc. are fully mixed. Next, the resin composition for forming an electrode of this embodiment is kneading the mixed resin composition by a disperser, a kneader, a three-roll mill, or the like. Finally, the resin composition for forming an electrode of this embodiment can be prepared by defoaming the kneaded resin composition.

以此方式獲得之電極形成用樹脂組合物可用於形成電氣、電子零件之電極等之用途,其觸變比(25℃下之2 rpm之黏度與20 rpm之黏度之比率)可為1.1~2.0,可為1.1~1.5,亦可為1.2~1.4。若觸變比為該範圍,則塗佈外觀優異,並且接著性、耐濕、耐熱處理後之電阻之穩定性等優異。The resin composition for electrode formation obtained in this way can be used to form electrodes of electrical and electronic parts, and its thixotropy ratio (the ratio of the viscosity at 25°C at 2 rpm to the viscosity at 20 rpm) can be 1.1 to 2.0 , Can be 1.1 to 1.5, or 1.2 to 1.4. If the thixotropy ratio is in this range, the coating appearance is excellent, and the adhesiveness, moisture resistance, resistance stability after heat treatment, etc. are excellent.

若觸變比未達1.1,則有於製造電子零件時之浸漬塗佈時因拉絲而導致作業性降低之虞,若觸變比超過2.0,則有於浸漬塗佈時產生稜角,用作電氣、電子零件之外部電極之情形時尺寸穩定性降低之虞,任一情形均有作為電子零件之良率變差之虞。If the thixotropy ratio is less than 1.1, the workability may be reduced due to wire drawing during dip coating in the manufacture of electronic parts. If the thixotropy ratio exceeds 2.0, edges and corners may occur during dip coating, which may be used as electrical components. , In the case of external electrodes of electronic parts, the dimensional stability may decrease. In any case, the yield rate of electronic parts may deteriorate.

又,形成為電子零件之外部電極之電極形成用樹脂組合物之硬化物之膜厚可為5~100 μm。若膜厚未達5 μm,則有向所需部分之塗佈性差、欠缺塗膜均勻性且產生針孔之虞,若超過100 μm,則有硬化時產生下垂,欠缺塗膜均勻性之虞。In addition, the thickness of the cured product of the electrode-forming resin composition formed as the external electrode of the electronic component may be 5-100 μm. If the film thickness is less than 5 μm, there is a risk of poor spreadability to the required part, lack of uniformity of the coating film, and pinholes. If it exceeds 100 μm, it may sag during curing and may lack uniformity of the coating film. .

雖然於電子零件之製造步驟中,浸漬塗佈電極形成用樹脂組合物時藉由刮漿板而使浸漬槽之表面平坦化,但就連續作業之效率而言,需要電極形成用樹脂組合物之黏度變化率(增黏率)為200%以下。Although the surface of the dipping tank is flattened by a doctor blade during the process of dipping and coating the resin composition for forming electrodes in the manufacturing steps of electronic parts, the efficiency of continuous operation requires the use of the resin composition for forming electrodes. The viscosity change rate (thickness increase rate) is 200% or less.

以此方式獲得之本實施形態之電極形成用樹脂組合物之硬化物成為車載零件級別之耐環境性能(超耐濕性、超耐熱性)及高導熱性、散熱性優異者。因此,於使用該電極形成用樹脂組合物形成電子零件之內部電極或外部電極之情形時,可見特性顯著提昇。例如,於用作電感器之外部電極之情形時,由於線圈與金屬直接結合,且與除線圈以外之坯體可藉由樹脂接著力表現較高之接合力,故能夠有助於降低電阻值及提昇車載等級中之可靠性。The cured product of the electrode-forming resin composition of the present embodiment obtained in this way has excellent environmental resistance (super moisture resistance, super heat resistance), high thermal conductivity, and excellent heat dissipation at the automotive parts level. Therefore, when the resin composition for electrode formation is used to form the internal electrode or the external electrode of an electronic component, the visible characteristics are significantly improved. For example, when used as an external electrode of an inductor, since the coil is directly bonded to the metal, and the body other than the coil can be bonded to the body by the resin to exhibit high bonding force, it can help reduce the resistance value And improve the reliability in the vehicle level.

其次,針對本實施形態之晶片型電子零件及其製造方法進行說明。 本實施形態之晶片型電子零件係具有包含陶瓷燒結體之長方體形狀之晶片型電子零件坯體的晶片型電子零件,形成於晶片型電子零件坯體之內部之內部電極及形成於晶片型電子零件坯體之端面之外部電極之至少1個為上述實施形態之電極形成用樹脂組合物之燒結體。此時獲得之燒結體之體積電阻率較佳為1×10-4 Ω·cm以下。進而,體積電阻率越低則作為電子零件之特性越提昇,故該體積電阻率可為1×10-5 Ω·cm以下。若體積電阻率超過1×10-4 Ω·cm,有導致製品可靠性變差之虞。若電極形成用樹脂組合物未充分燒結,可能有體積電阻率超過1×10-4 Ω·cm之情形。Next, a description will be given of the wafer-type electronic component and its manufacturing method of this embodiment. The chip-type electronic component of this embodiment is a chip-type electronic component having a cuboid-shaped chip-type electronic component body including a ceramic sintered body, internal electrodes formed in the chip-type electronic component body and the chip-type electronic component At least one of the external electrodes on the end surface of the green body is a sintered body of the resin composition for electrode formation of the above embodiment. The volume resistivity of the sintered body obtained at this time is preferably 1×10 -4 Ω·cm or less. Furthermore, the lower the volume resistivity, the better the characteristics of electronic parts, so the volume resistivity can be 1×10 -5 Ω·cm or less. If the volume resistivity exceeds 1×10 -4 Ω·cm, the reliability of the product may deteriorate. If the resin composition for electrode formation is not sufficiently sintered, the volume resistivity may exceed 1×10 -4 Ω·cm.

於製造本實施形態之晶片型電子零件時,使用本實施形態之電極形成用樹脂組合物於陶瓷層之表面藉由印刷而形成特定之電極圖案層。 本實施形態之晶片型電子零件之製造方法之下一步驟係於該電極圖案層之上載置其他陶瓷層,於該其他陶瓷層之表面使用本實施形態之電極形成用樹脂組合物藉由印刷而形成特定之電極圖案層,反覆進行該操作,使陶瓷層與電極圖案層交替地積層。When manufacturing the chip-type electronic component of this embodiment, the resin composition for electrode formation of this embodiment is used to form a specific electrode pattern layer by printing on the surface of a ceramic layer. The next step of the method for manufacturing a chip-type electronic component of this embodiment is to place another ceramic layer on the electrode pattern layer, and use the resin composition for electrode formation of this embodiment on the surface of the other ceramic layer to be printed A specific electrode pattern layer is formed, and this operation is repeated, so that the ceramic layer and the electrode pattern layer are alternately laminated.

本實施形態之晶片型電子零件之製造方法之下一步驟係燒結所獲得之積層體,藉此製成具有藉由電極圖案形成之內部電極之晶片型電子零件坯體。 本實施形態之晶片型電子零件之製造方法之最後之步驟係於該晶片型電子零件坯體之端面形成外部電極,獲得晶片型電子零件。此時,外部電極之形成可使用本實施形態之電極形成用樹脂組合物。The next step of the method of manufacturing a wafer-type electronic component of this embodiment is to sinter the obtained laminate, thereby producing a wafer-type electronic component blank having internal electrodes formed by electrode patterns. The final step of the method of manufacturing a wafer-type electronic component of this embodiment is to form an external electrode on the end surface of the wafer-type electronic component blank to obtain a wafer-type electronic component. In this case, the resin composition for electrode formation of this embodiment can be used for the formation of external electrodes.

於製造本實施形態之其他晶片型電子零件時,將本實施形態之電極形成用樹脂組合物藉由印刷或浸漬而塗佈於晶片型電子零件坯體之端面,燒結所塗佈之該電極形成用樹脂組合物,藉此形成外部電極,獲得晶片型電子零件。 此時,於本實施形態中,上述電極形成用樹脂組合物可藉由如先前般加熱而燒結,進而,即使於100~300℃下燒結亦可充分地確保導電性。又,該電極形成用樹脂組合物之浸漬塗佈時之連續作業性良好,可有效率地形成電極。 [實施例]When manufacturing other chip-type electronic parts of this embodiment, the electrode-forming resin composition of this embodiment is applied to the end surface of the chip-type electronic part body by printing or dipping, and the coated electrode is formed by sintering The resin composition is used to form external electrodes to obtain wafer-type electronic parts. At this time, in this embodiment, the resin composition for forming an electrode can be sintered by heating as before, and furthermore, sufficient conductivity can be ensured even if it is sintered at 100 to 300°C. In addition, the continuous workability during dip coating of the resin composition for electrode formation is good, and the electrode can be formed efficiently. [Example]

其次,藉由實施例進一步詳細地說明本實施形態,但本實施形態並不限定於該等實施例。Next, the present embodiment will be described in further detail with examples, but the present embodiment is not limited to these examples.

(實施例1~12、比較例1~4) 按照表1~3之記載之組成將各成分混合,利用輥進行混練,獲得電極形成用樹脂組合物。表1~3中各成分之調配量係以質量份表示。按以下之方法評價獲得之樹脂組合物。將該結果一併示於表1~3。再者,實施例及比較例中使用之材料係使用具有下述特性者。(Examples 1 to 12, Comparative Examples 1 to 4) Each component was mixed according to the composition described in Tables 1 to 3 and kneaded with a roller to obtain a resin composition for forming an electrode. The blending amount of each component in Tables 1 to 3 is expressed in parts by mass. The obtained resin composition was evaluated according to the following method. The results are shown in Tables 1 to 3. In addition, the materials used in the examples and comparative examples are those having the following characteristics.

[(A)成分] (A1)丙烯酸系樹脂:羥基乙基丙烯醯胺(Kohjin(股)製造、商品名:HEAA) (A21)醯亞胺擴張型雙馬來醯亞胺(Designer molecules公司製造、商品名:BMI-1500;數量平均分子量1500) (A22)醯亞胺擴張型雙馬來醯亞胺(Designer molecules公司製造、商品名:BMI-689;數量平均分子量689) (A31)環氧化聚丁二烯樹脂(日本曹達(股)製造、商品名:JP-200) (A32)末端丙烯酸酯型聚丁二烯樹脂(日本曹達(股)製造、商品名:TE-2000)[(A) Ingredient] (A1) Acrylic resin: Hydroxyethyl acrylamide (manufactured by Kohjin Co., Ltd., trade name: HEAA) (A21) Dimaleimide expanded bismaleimide (manufactured by Designer molecules, trade name: BMI-1500; number average molecular weight 1500) (A22) Dimaleimide-extended bismaleimide (manufactured by Designer molecules, trade name: BMI-689; number average molecular weight 689) (A31) Epoxidized polybutadiene resin (manufactured by Japan Soda Co., Ltd., trade name: JP-200) (A32) Terminal acrylate type polybutadiene resin (manufactured by Soda Corporation, trade name: TE-2000)

除(A1)~(A3)以外之熱硬化性樹脂 環氧樹脂:雙酚F型液狀環氧樹脂(三菱化學(股)製造、商品名:YL983U) 酚樹脂:雙酚F(本州化學工業(股)製造、商品名:雙酚F)Thermosetting resin except (A1)~(A3) Epoxy resin: Bisphenol F type liquid epoxy resin (manufactured by Mitsubishi Chemical Corporation, trade name: YL983U) Phenol resin: Bisphenol F (manufactured by Honshu Chemical Industry Co., Ltd., trade name: Bisphenol F)

[(B)成分] 自由基起始劑:過氧化二異丙苯(日本油脂(股)製造、商品名:Percumyl D;快速加熱試驗中之分解溫度:126℃)[(B) Ingredient] Free radical initiator: Dicumyl peroxide (manufactured by Nippon Oil & Fats Co., Ltd., trade name: Percumyl D; decomposition temperature in rapid heating test: 126°C)

[(C)成分] 板型銀微粒子(Tokusen Kogyo(股)製造、商品名:M13;中心粒徑:2 μm、厚度:50 nm以下) 球狀銀微粒子(DOWA Electronics(股)製造、商品名:Ag nano powder-1;平均粒徑:20 nm)[(C) Ingredient] Plate-shaped silver particles (manufactured by Tokusen Kogyo Co., Ltd., trade name: M13; center particle size: 2 μm, thickness: 50 nm or less) Spherical silver particles (manufactured by DOWA Electronics, trade name: Ag nano powder-1; average particle diameter: 20 nm)

[(D)成分] 銀粉A(形狀:薄片狀、平均粒徑:4.0 μm、厚度:0.3 μm以上、振實密度:5.5 g/cm3 ) 銀粉B(形狀:薄片狀、平均粒徑:3.0 μm、厚度:0.3 μm以上、振實密度:3.8 g/cm3 ) 銀粉C(形狀:球狀、平均粒徑:2.4 μm、振實密度:5.0 g/cm3 )[Component (D)] Silver powder A (shape: flake, average particle size: 4.0 μm, thickness: 0.3 μm or more, tap density: 5.5 g/cm 3 ) silver powder B (shape: flake, average particle size: 3.0 μm, thickness: 0.3 μm or more, tap density: 3.8 g/cm 3 ) Silver powder C (shape: spherical, average particle size: 2.4 μm, tap density: 5.0 g/cm 3 )

[(E)成分] 溶劑:2-乙基-1,3-己二醇(東京化成工業(股)製造) [其他成分] 稀釋溶劑:丁基卡必醇(東京化成工業(股)製造) 硬化促進劑:1-苄基-2-苯基咪唑(四國化成工業(股)製造、商品名:1B2PZ) 添加劑:矽烷偶合劑(信越化學工業(股)製造、商品名:KBM-503)[(E) Ingredient] Solvent: 2-ethyl-1,3-hexanediol (manufactured by Tokyo Chemical Industry Co., Ltd.) [Other ingredients] Dilution solvent: Butyl carbitol (manufactured by Tokyo Chemical Industry Co., Ltd.) Hardening accelerator: 1-benzyl-2-phenylimidazole (manufactured by Shikoku Chemical Industry Co., Ltd., trade name: 1B2PZ) Additive: Silane coupling agent (manufactured by Shin-Etsu Chemical Co., Ltd., trade name: KBM-503)

[表1]    實施例 1 2 3 4 5 6 組成 (A)成分 (A1)丙烯酸系樹脂 25          25 25 (A21)醯亞胺擴張型雙馬來醯亞胺樹脂       50 50    25 (A22)醯亞胺擴張型雙馬來醯亞胺樹脂 25 50       25    (A31)環氧化聚丁二烯樹脂             50 50 (A32)丙烯酸酯型聚丁二烯樹脂 50 50 50 50       環氧樹脂                   酚樹脂                   (B)成分 自由基起始劑 5 5 5 5 5 5 (C)成分 板型銀微粒子 250 250    250 250 250 球狀銀微粒子       250          (D)成分 銀粉A 750 750 750    750 750 銀粉B          750       銀粉C                   (E)成分 2-烷基-1,3-己二醇 50 50 50 50 50 50 其他 稀釋溶劑                   硬化促進劑                   添加劑 5 5 5 5 5 5 特性 黏度(Pa·s) 30 25 35 25 25 22 觸變比 1.4 1.4 1.6 1.5 1.7 1.3 體積電阻率(×10-6 Ω·cm) 10 10 10 10 10 10 塗佈外觀 固著強度(N) 30 28 35 38 37 37 1%重量減少溫度(TG/DTA)(℃) 348 352 352 352 352 352 硬化物吸水率(%) 0.08 0.10 0.10 0.10 0.10 0.10 耐熱通電試驗後之電阻值之變化率1(%) 150℃ 500小時 100 100 100 100 100 100 1000小時 100 100 100 100 100 100 2000小時 100 100 100 100 100 100 3000小時 100 100 100 100 100 100 耐濕通電試驗後之電阻值之變化率2(%) 85℃/85% 500小時 100 100 100 100 100 100 1000小時 100 99 99 99 99 99 2000小時 99 98 98 98 98 98 3000小時 98 97 97 97 97 97 [Table 1] Example 1 2 3 4 5 6 composition (A) Ingredient (A1) Acrylic resin 25 25 25 (A21) Dimaleimide extended bismaleimide resin 50 50 25 (A22) Dimaleimide extended bismaleimide resin 25 50 25 (A31) Epoxidized polybutadiene resin 50 50 (A32) Acrylic type polybutadiene resin 50 50 50 50 Epoxy resin Phenol resin (B) Ingredient Free radical initiator 5 5 5 5 5 5 (C) Ingredients Plate type silver particles 250 250 250 250 250 Spherical silver particles 250 (D) Ingredients Silver powder A 750 750 750 750 750 Silver powder B 750 Silver Powder C (E) Ingredients 2-alkyl-1,3-hexanediol 50 50 50 50 50 50 other Dilution solvent Hardening accelerator additive 5 5 5 5 5 5 characteristic Viscosity (Pa·s) 30 25 35 25 25 twenty two Thixotropy ratio 1.4 1.4 1.6 1.5 1.7 1.3 Volume resistivity (×10 -6 Ω·cm) 10 10 10 10 10 10 Coating appearance good good good good good good Fixing strength (N) 30 28 35 38 37 37 1% weight reduction temperature (TG/DTA)(℃) 348 352 352 352 352 352 Water absorption rate of hardened material (%) 0.08 0.10 0.10 0.10 0.10 0.10 Change rate of resistance value after heat resistance energization test 1(%) 150℃ 500 hours 100 100 100 100 100 100 1000 hours 100 100 100 100 100 100 2000 hours 100 100 100 100 100 100 3000 hours 100 100 100 100 100 100 The rate of change of the resistance value after the humidity resistance test is 2(%) 85℃/85% 500 hours 100 100 100 100 100 100 1000 hours 100 99 99 99 99 99 2000 hours 99 98 98 98 98 98 3000 hours 98 97 97 97 97 97

[表2]    實施例 7 8 9 10 11 12 組成 (A)成分 (A1)丙烯酸系樹脂          25       (A21)醯亞胺擴張型雙馬來醯亞胺樹脂       50 35 30 50 (A22)醯亞胺擴張型雙馬來醯亞胺樹脂 50 50             (A31)環氧化聚丁二烯樹脂                   (A32)丙烯酸酯型聚丁二烯樹脂 50 50 50 40 70 50 環氧樹脂                   酚樹脂                   (B)成分 自由基起始劑 5 5 5 5 5 5 (C)成分 板型銀微粒子 250 250    250 250 250 球狀銀微粒子       250          (D)成分 銀粉A 750       750 750 750 銀粉B                   銀粉C    750 750          (E)成分 2-烷基-1,3-己二醇 50 50 50 50 50 40 其他 稀釋溶劑                10 硬化促進劑                   添加劑 5 5 5 5 5 5 特性 黏度(Pa·s) 26 29 15 33 26 25 觸變比 1.3 1.2 1.8 1.3 1.4 2.0 體積電阻率(×10-6 Ω·cm) 10 12 12 10 10 14 塗佈外觀 固著強度(N) 36 35 30 33 37 38 1%重量減少溫度(TG/DTA)(℃) 352 352 352 340 345 352 硬化物吸水率(%) 0.10 0.10 0.10 0.11 0.11 0.10 耐熱通電試驗後之電阻值之變化率(1%) 150℃ 500小時 100 100 100 101 100 100 1000小時 100 100 100 102 100 100 2000小時 100 100 100 103 101 100 3000小時 100 100 100 105 102 100 耐濕通電試驗後之電阻值之變化率2(%) 85℃/85% 500小時 100 100 100 101 100 100 1000小時 99 99 99 102 101 99 2000小時 98 98 98 104 102 98 3000小時 97 97 97 106 104 97 [Table 2] Example 7 8 9 10 11 12 composition (A) Ingredient (A1) Acrylic resin 25 (A21) Dimaleimide extended bismaleimide resin 50 35 30 50 (A22) Dimaleimide extended bismaleimide resin 50 50 (A31) Epoxidized polybutadiene resin (A32) Acrylic type polybutadiene resin 50 50 50 40 70 50 Epoxy resin Phenol resin (B) Ingredient Free radical initiator 5 5 5 5 5 5 (C) Ingredients Plate type silver particles 250 250 250 250 250 Spherical silver particles 250 (D) Ingredients Silver powder A 750 750 750 750 Silver powder B Silver Powder C 750 750 (E) Ingredients 2-alkyl-1,3-hexanediol 50 50 50 50 50 40 other Dilution solvent 10 Hardening accelerator additive 5 5 5 5 5 5 characteristic Viscosity (Pa·s) 26 29 15 33 26 25 Thixotropy ratio 1.3 1.2 1.8 1.3 1.4 2.0 Volume resistivity (×10 -6 Ω·cm) 10 12 12 10 10 14 Coating appearance good good good good good can Fixing strength (N) 36 35 30 33 37 38 1% weight reduction temperature (TG/DTA)(℃) 352 352 352 340 345 352 Water absorption rate of hardened material (%) 0.10 0.10 0.10 0.11 0.11 0.10 Change rate of resistance value after heat resistance energization test (1%) 150℃ 500 hours 100 100 100 101 100 100 1000 hours 100 100 100 102 100 100 2000 hours 100 100 100 103 101 100 3000 hours 100 100 100 105 102 100 The rate of change of the resistance value after the humidity resistance test is 2(%) 85℃/85% 500 hours 100 100 100 101 100 100 1000 hours 99 99 99 102 101 99 2000 hours 98 98 98 104 102 98 3000 hours 97 97 97 106 104 97

[表3]    比較例 1 2 3 4 組成 (A)成分 (A1)丙烯酸系樹脂 100 25       (A21)醯亞胺擴張型雙馬來醯亞胺樹脂             (A22)醯亞胺擴張型雙馬來醯亞胺樹脂    25       (A31)環氧化聚丁二烯樹脂             (A32)丙烯酸酯型聚丁二烯樹脂    50       環氧樹脂       100 100 酚樹脂       20 20 (B)成分 自由基起始劑 5 5       (C)成分 板型銀微粒子    250       球狀銀微粒子          400 (D)成分 銀粉A 1000 750 1000 600 銀粉B             銀粉C             (E)成分 2-烷基-1,3-己二醇             其他 稀釋溶劑 50 50 100 100 硬化促進劑       1 1 添加劑 5 5       特性 黏度(Pa·s) 10 11 20 15 觸變比 3.5 3 3.8 3.5 體積電阻率(×10-6 Ω·cm) 90 13 80 20 塗佈外觀 不良 不良 不良 不良 固著強度(N) 30 33 35 38 1%重量減少溫度(TG/DTA)(℃) 320 261 275 300 硬化物吸水率(%) 0.21 1.2 1.2 1.2 耐熱通電試驗後之電阻值之變化率1(%) 150℃ 500小時 >110 103 103 103 1000小時 >110 108 108 108 2000小時 >110 >110 >110 >110 3000小時 >110 >110 >110 >110 耐濕通電試驗後之電阻值之變化率2(%) 85℃/85% 500小時 >110 >110 >110 >110 1000小時 >110 >110 >110 >110 2000小時 >110 >110 >110 >110 3000小時 >110 >110 >110 >110 [table 3] Comparative example 1 2 3 4 composition (A) Ingredient (A1) Acrylic resin 100 25 (A21) Dimaleimide extended bismaleimide resin (A22) Dimaleimide extended bismaleimide resin 25 (A31) Epoxidized polybutadiene resin (A32) Acrylic type polybutadiene resin 50 Epoxy resin 100 100 Phenol resin 20 20 (B) Ingredient Free radical initiator 5 5 (C) Ingredients Plate type silver particles 250 Spherical silver particles 400 (D) Ingredients Silver powder A 1000 750 1000 600 Silver powder B Silver Powder C (E) Ingredients 2-alkyl-1,3-hexanediol other Dilution solvent 50 50 100 100 Hardening accelerator 1 1 additive 5 5 characteristic Viscosity (Pa·s) 10 11 20 15 Thixotropy ratio 3.5 3 3.8 3.5 Volume resistivity (×10 -6 Ω·cm) 90 13 80 20 Coating appearance bad bad bad bad Fixing strength (N) 30 33 35 38 1% weight reduction temperature (TG/DTA)(℃) 320 261 275 300 Water absorption rate of hardened material (%) 0.21 1.2 1.2 1.2 Change rate of resistance value after heat resistance energization test 1(%) 150℃ 500 hours >110 103 103 103 1000 hours >110 108 108 108 2000 hours >110 >110 >110 >110 3000 hours >110 >110 >110 >110 The rate of change of the resistance value after the humidity resistance test is 2(%) 85℃/85% 500 hours >110 >110 >110 >110 1000 hours >110 >110 >110 >110 2000 hours >110 >110 >110 >110 3000 hours >110 >110 >110 >110

<評價方法> [黏度] 使用E型黏度計(3°錐形),測定25℃、2 rpm下之值。 [觸變比] 使用E型黏度計(3°錐形),測定25℃下、2 rpm及20 rpm下之黏度,將2 rpm之黏度相對於20 rpm之黏度之比(2 rpm之黏度/20 rpm之黏度)設為觸變比。<Evaluation method> [Viscosity] Use E-type viscometer (3° cone) to measure the value at 25°C and 2 rpm. [Thixotropic ratio] Use an E-type viscometer (3° cone) to measure the viscosity at 25°C, 2 rpm and 20 rpm, and compare the viscosity at 2 rpm to the viscosity at 20 rpm (viscosity at 2 rpm/viscosity at 20 rpm) Set to thixotropic ratio.

[體積電阻率] 藉由網版印刷法以5 mm×50 mm、厚度30 μm將電極形成用樹脂組合物塗佈於玻璃基板(厚度1 mm),於200℃下硬化60分鐘。使用製品名「MCP-T600」(三菱化學(股)製造)利用四端子法測定獲得之配線之電阻。[Volume resistivity] The resin composition for electrode formation was applied to a glass substrate (thickness 1 mm) by a screen printing method with a thickness of 5 mm × 50 mm and a thickness of 30 μm, and cured at 200° C. for 60 minutes. Using the product name "MCP-T600" (manufactured by Mitsubishi Chemical Corporation), the resistance of the obtained wiring was measured by the four-terminal method.

[塗佈外觀] 藉由浸漬塗佈使電極形成用樹脂組合物於晶片型電子零件坯體之兩端成膜,於200℃下進行60分鐘之加熱硬化,製成電子零件。將此時獲得之電子零件中因電極形成用樹脂組合物之階差等而無法獲得尺寸穩定性者記為NG。是否獲得尺寸穩定性之判斷係利用顯微鏡觀察電極剖面,將面之凹凸之差未達40 μm判定為「良」,將表面之凹凸之差為40~100 μm判定為「可」,將超過100 μm者判定為「不良」。[Appearance of coating] The resin composition for electrode formation is formed into a film on both ends of the wafer-type electronic component body by dip coating, and it is heated and cured at 200° C. for 60 minutes to produce an electronic component. Among the electronic parts obtained at this time, the dimensional stability cannot be obtained due to the step difference of the resin composition for electrode formation, etc., was designated as NG. Whether the dimensional stability is obtained is determined by observing the electrode cross-section with a microscope, and the difference between the unevenness of the surface is less than 40 μm as "good", and the difference between the unevenness of the surface is 40-100 μm as "good", and the difference is more than 100 μm is judged as "bad".

[1%重量減少溫度] 於200℃下使各實施例及各比較例中獲得之電極形成用樹脂組合物10 mg硬化1小時之後,使用TG/DTA7200熱重量分析裝置(SII NanoTechnology股份有限公司製造)作為測定裝置,一面通入壓縮空氣一面於室溫(25℃)至600℃之範圍內以10℃/分鐘之條件進行加熱,測定使用之試樣之重量減少1%之溫度,藉此而求出。 [硬化物吸水率] 使用膜厚為200 μm、大小為500 mm見方之硬化物,以初始重量為基準,測定於85℃、85%高溫恆濕槽放置168小時後之重量,藉此而求出。[1% weight reduction temperature] After curing 10 mg of the electrode-forming resin composition obtained in each example and each comparative example at 200°C for 1 hour, a TG/DTA7200 thermogravimetric analyzer (manufactured by SII NanoTechnology Co., Ltd.) was used as the measuring device. The compressed air is heated at a temperature of 10°C/min in the range of room temperature (25°C) to 600°C, and the temperature at which the weight of the sample used is reduced by 1% is determined by this. [Water absorption rate of hardened material] Using a hardened product with a film thickness of 200 μm and a size of 500 mm square, the initial weight is used as a basis, and the weight is measured after being placed in a 85°C, 85% high temperature and humidity bath for 168 hours to obtain the result.

[固著強度] 藉由浸漬塗佈而使電極形成用樹脂組合物於晶片型電子零件坯體之兩端成膜,於200℃下進行60分鐘之加熱硬化。於其上實施Ni及Sn鍍覆,藉由焊接安裝於基板,製成電子零件。以20 mm/分鐘橫推該電子零件並測定剪切強度,將破壞時之負重設為固著強度(N)。[Fixed Strength] The resin composition for electrode formation was formed into a film on both ends of a wafer-type electronic component body by dip coating, and the film was heated and cured at 200°C for 60 minutes. Ni and Sn are plated on it and mounted on the substrate by soldering to make electronic parts. Push the electronic part horizontally at 20 mm/min, measure the shear strength, and set the load at the time of failure as the fixing strength (N).

[耐熱通電試驗後之電阻值變化率1] 藉由浸漬塗佈使電極形成用樹脂組合物於晶片型電子零件坯體之兩端成膜,於200℃下進行60分鐘之加熱硬化。於其上實施Ni及Sn鍍覆,藉由焊接安裝於基板,製成電子零件。 將該電子零件放入恆溫槽(溫度150℃),於該狀態下實施通電試驗(1A),算出相對於初始值之經過500小時後、經過1000小時後、經過2000小時後、經過3000小時後之相對值。[Change rate of resistance value after heat resistance energization test 1] The resin composition for electrode formation was formed into a film on both ends of the wafer-type electronic component body by dip coating, and the film was heated and cured at 200°C for 60 minutes. Ni and Sn are plated on it and mounted on the substrate by soldering to make electronic parts. Put the electronic component in a constant temperature bath (temperature 150°C), perform an energization test (1A) in this state, calculate the initial value after 500 hours, after 1000 hours, after 2000 hours, after 3000 hours The relative value.

[耐濕通電試驗後之電阻值變化率2] 藉由浸漬塗佈使電極形成用樹脂組合物於晶片型電子零件坯體之兩端成膜,於200℃下進行60分鐘之加熱硬化。於其上實施Ni及Sn鍍覆,藉由焊接安裝於基板,製成電子零件。[Change rate of resistance value after humidity resistance test 2] The resin composition for electrode formation was formed into a film on both ends of the wafer-type electronic component body by dip coating, and the film was heated and cured at 200°C for 60 minutes. Ni and Sn are plated on it and mounted on the substrate by soldering to make electronic parts.

將該電子零件放入恆溫恆濕槽(溫度85℃、濕度85%),於該狀態下實施通電試驗(1A),算出相對於初始值之經過500小時後、經過1000小時後、經過2000小時後、經過3000小時後之相對值。Put the electronic component in a constant temperature and humidity chamber (temperature 85°C, humidity 85%), and perform an energization test (1A) in this state, and calculate the initial value after 500 hours, after 1000 hours, and after 2000 hours. The relative value after 3000 hours.

根據以上結果可知,使用本實施形態之電極形成用樹脂組合物之電子零件可獲得任一特性均良好之高可靠性之電子零件。From the above results, it can be seen that an electronic component using the resin composition for forming an electrode of the present embodiment can obtain a highly reliable electronic component with good properties.

Claims (12)

一種電極形成用樹脂組合物,其特徵在於:其係包含(A)熱硬化性樹脂、(B)自由基起始劑、(C)厚度或短徑為1~200 nm之銀微粒子及(D)除上述(C)成分以外之平均粒徑為2~20 μm之銀粉者,且 其觸變比(25℃下之2 rpm之黏度與20 rpm之黏度之比率)為1.1~2.0。A resin composition for forming an electrode, characterized in that it contains (A) a thermosetting resin, (B) a radical initiator, (C) silver particles with a thickness or short diameter of 1 to 200 nm, and (D ) Silver powder with an average particle size of 2-20 μm other than the above (C) component, and The thixotropy ratio (the ratio of the viscosity at 25°C at 2 rpm to the viscosity at 20 rpm) is 1.1 to 2.0. 如請求項1之電極形成用樹脂組合物,其中上述(A)熱硬化性樹脂包含選自(A1)具有羥基之(甲基)丙烯酸酯化合物或(甲基)丙烯醯胺化合物、(A2)常溫下為液狀之雙馬來醯亞胺樹脂及(A3)聚丁二烯之至少1種。The resin composition for forming an electrode according to claim 1, wherein the above-mentioned (A) thermosetting resin comprises (A1) a (meth)acrylate compound having a hydroxyl group or a (meth)acrylamide compound, (A2) At least one of bismaleimide resin and (A3) polybutadiene that is liquid at room temperature. 如請求項2之電極形成用樹脂組合物,其中上述(A)熱硬化性樹脂係以上述(A1)具有羥基之(甲基)丙烯酸酯化合物或(甲基)丙烯醯胺化合物0~75質量%、上述(A2)雙馬來醯亞胺樹脂10~90質量%、上述(A3)聚丁二烯10~90質量%之比率調配而成。The resin composition for forming an electrode according to claim 2, wherein the above-mentioned (A) thermosetting resin is based on the above-mentioned (A1) a (meth)acrylate compound having a hydroxyl group or a (meth)acrylamide compound by 0 to 75 mass %, the above (A2) bismaleimide resin is 10 to 90% by mass, and the above (A3) polybutadiene is 10 to 90% by mass. 如請求項1至3中任一項之電極形成用樹脂組合物,其中上述(A1)(甲基)丙烯酸酯化合物或(甲基)丙烯醯胺化合物係含有選自以下通式(1)~(4)之至少1種化合物之丙烯酸系樹脂, [化1]
Figure 03_image019
(式中,R1 表示氫原子或甲基,R2 表示碳數1~100之2價之脂肪族烴基或具有環狀結構之脂肪族烴基) [化2]
Figure 03_image021
(式中,R1 及R2 分別表示與上述相同者) [化3]
Figure 03_image023
(式中,R1 表示與上述相同者,n表示1~50之整數) [化4]
Figure 03_image025
(式中,R1 及n分別表示與上述相同者)。
The resin composition for forming an electrode according to any one of claims 1 to 3, wherein the (A1) (meth)acrylate compound or (meth)acrylamide compound is selected from the following general formulas (1) to (4) Acrylic resin of at least one compound, [化1]
Figure 03_image019
(In the formula, R 1 represents a hydrogen atom or a methyl group, and R 2 represents a divalent aliphatic hydrocarbon group having 1 to 100 carbon atoms or an aliphatic hydrocarbon group having a cyclic structure) [化2]
Figure 03_image021
(In the formula, R 1 and R 2 respectively represent the same as the above) [化3]
Figure 03_image023
(In the formula, R 1 represents the same as above, and n represents an integer of 1-50) [Chemical 4]
Figure 03_image025
(In the formula, R 1 and n each represent the same as the above).
如請求項1至3中任一項之電極形成用樹脂組合物,其中上述(A2)雙馬來醯亞胺樹脂係以下通式(5)或(6)所表示之化合物, [化5]
Figure 03_image027
(式中,Q表示碳數6以上之2價之直鏈狀、支鏈狀或環狀之脂肪族烴基,P為選自O、CO、COO、CH2 、C(CH3 )2 、C(CF3 )2 、S、S2 、SO及SO2 之2價之原子或有機基、或包含至少1個以上該等原子或有機基之有機基,m表示1~10之整數) [化6]
Figure 03_image029
(式中,R3 ~R6 表示碳數6以上之2價之直鏈狀、支鏈狀或環狀之脂肪族烴基)。
The resin composition for forming an electrode according to any one of claims 1 to 3, wherein the above-mentioned (A2) bismaleimide resin is a compound represented by the following general formula (5) or (6), [化5]
Figure 03_image027
(In the formula, Q represents a bivalent linear, branched or cyclic aliphatic hydrocarbon group with 6 or more carbons, and P is selected from O, CO, COO, CH 2 , C(CH 3 ) 2 , C (CF 3 ) 2 , S, S 2 , SO and SO 2 divalent atoms or organic groups, or organic groups containing at least one of these atoms or organic groups, m represents an integer from 1 to 10) [化6]
Figure 03_image029
(In the formula, R 3 to R 6 represent a divalent linear, branched or cyclic aliphatic hydrocarbon group with 6 or more carbon atoms).
如請求項1至3中任一項之電極形成用樹脂組合物,其中上述電極形成用樹脂組合物進而包含碳數5~10之支鏈狀二醇作為(E)溶劑。The resin composition for forming an electrode according to any one of claims 1 to 3, wherein the resin composition for forming an electrode further comprises a branched diol having 5 to 10 carbon atoms as the (E) solvent. 如請求項1至3中任一項之電極形成用樹脂組合物,其中於將上述(A)~(D)成分之合計設為100質量%時,含有上述(A)熱硬化性樹脂1~15質量%、上述(C)銀微粒子5~40質量%、上述(D)銀粉50~90質量%,且相對於上述(A)熱硬化性樹脂100質量份,含有上述(B)自由基起始劑0.1~10質量份。The resin composition for forming an electrode according to any one of claims 1 to 3, which contains the (A) thermosetting resin 1 to (A) when the total of the components (A) to (D) is 100% by mass 15% by mass, the above (C) silver fine particles 5-40% by mass, the above (D) silver powder 50-90% by mass, and relative to the above (A) thermosetting resin 100 mass parts, containing the above (B) radical The starting agent is 0.1-10 parts by mass. 如請求項6之電極形成用樹脂組合物,其中於將上述(A)~(D)成分之合計設為100質量份時,含有上述(E)成分1~10質量份。The resin composition for forming an electrode according to claim 6, which contains 1 to 10 parts by mass of the component (E) when the total of the components (A) to (D) is 100 parts by mass. 一種晶片型電子零件,其特徵在於:晶片型電子零件具有包含陶瓷燒結體之長方體形狀之晶片型電子零件坯體,且位於上述晶片型電子零件之內部之內部電極及位於上述晶片型電子零件坯體之端面之外部電極之至少1個為如請求項1至8中任一項之電極形成用樹脂組合物之燒結體。A chip-type electronic part, characterized in that: the chip-type electronic part has a cuboid-shaped chip-type electronic part blank containing a ceramic sintered body, and internal electrodes located inside the chip-type electronic part and the chip-type electronic part blank At least one of the external electrodes on the end surface of the body is a sintered body of the resin composition for forming an electrode according to any one of claims 1 to 8. 一種晶片型電子零件之製造方法,其特徵在於:使用如請求項1至8中任一項之電極形成用樹脂組合物於陶瓷層之表面印刷特定之電極圖案層; 進而,於該電極圖案層之上載置其他陶瓷層,並使用如請求項1至7中任一項之電極形成用樹脂組合物於該其他陶瓷層之表面印刷特定之電極圖案層,反覆進行該操作,使陶瓷層與電極圖案層交替地積層; 燒結獲得之積層體,藉此製成具有藉由上述電極圖案層形成之內部電極之晶片型電子零件坯體;並且 於該晶片型電子零件坯體之端面形成外部電極。A method for manufacturing a wafer-type electronic component, characterized in that: using the resin composition for forming an electrode as in any one of claims 1 to 8 to print a specific electrode pattern layer on the surface of a ceramic layer; Furthermore, another ceramic layer is placed on the electrode pattern layer, and a specific electrode pattern layer is printed on the surface of the other ceramic layer using the resin composition for forming an electrode according to any one of claims 1 to 7, and this is repeated. Operation to alternately stack the ceramic layer and the electrode pattern layer; The laminated body obtained by sintering is thereby made into a wafer-type electronic component body having internal electrodes formed by the above-mentioned electrode pattern layer; and An external electrode is formed on the end surface of the wafer-type electronic component blank. 如請求項10之晶片型電子零件之製造方法,其中上述外部電極之形成係將如請求項1至8中任一項之電極形成用樹脂組合物藉由印刷或浸漬而塗佈於上述晶片型電子零件坯體之端面,並且燒結所塗佈之該電極形成用樹脂組合物而進行。The method of manufacturing a chip-type electronic component according to claim 10, wherein the formation of the external electrode is by printing or dipping the resin composition for forming an electrode as in any one of claims 1 to 8 to the chip type The end surface of the electronic part body is sintered and the applied resin composition for forming the electrode is sintered. 一種晶片型電子零件之製造方法,其特徵在於:將如請求項1至8中任一項之電極形成用樹脂組合物藉由印刷或浸漬而塗佈於晶片型電子零件坯體之端面,並且 燒結所塗佈之該電極形成用樹脂組合物,藉此形成外部電極。A method for manufacturing a wafer-type electronic part, characterized in that: the resin composition for forming an electrode as in any one of claims 1 to 8 is applied to the end surface of a wafer-type electronic part blank by printing or dipping, and The applied resin composition for forming an electrode is sintered, thereby forming an external electrode.
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