TW202017290A - Digital linear regulator and a power mos array thereof - Google Patents
Digital linear regulator and a power mos array thereof Download PDFInfo
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本發明係有關一種線性調節器,特別是關於一種具動態電流源功率金屬氧化物半導體(MOS)陣列的數位線性調節器。The invention relates to a linear regulator, in particular to a digital linear regulator with a dynamic current source power metal oxide semiconductor (MOS) array.
線性電壓調節器,例如低壓降(low-dropout)調節器為一種直流線性電壓調節器,可適用以調節輸出電壓。由於其尺寸小且設計簡單,因此普遍應用於單晶片系統(system on chip)以提供個別電壓。數位線性調節器由於其低壓操作,因此較佳應用於現代系統。Linear voltage regulators, such as low-dropout regulators, are a type of DC linear voltage regulators that can be adapted to regulate the output voltage. Due to its small size and simple design, it is commonly used in system on chip to provide individual voltages. Digital linear regulators are preferably used in modern systems due to their low voltage operation.
傳統數位線性調節器於非穩定的暫態(例如過衝(overshoot)或下衝(undershoot)電壓)時,由於其須等待下一時脈週期或/且類比至數位轉換(ADC)的轉換時間,因此回復較慢或消耗較大功率。一些數位線性調節器雖然具有改良的暫態回復或較小功耗,然而數位線性調節器會干擾相同接地的其他電路。Traditional digital linear regulators have to wait for the next clock cycle or/and analog-to-digital conversion (ADC) conversion time during unstable transients (such as overshoot or undershoot voltage), So the recovery is slower or consumes more power. Although some digital linear regulators have improved transient recovery or lower power consumption, digital linear regulators can interfere with other circuits that are grounded at the same time.
因此亟需提出一種新穎的數位線性調節器,以克服傳統數位線性調節器的缺失。Therefore, there is an urgent need to propose a novel digital linear regulator to overcome the lack of the traditional digital linear regulator.
鑑於上述,本發明實施例的目的之一在於提出一種具動態電流源功率金屬氧化物半導體(MOS)陣列的數位線性調節器。In view of the above, one of the objectives of the embodiments of the present invention is to provide a digital linear regulator with a dynamic current source power metal oxide semiconductor (MOS) array.
根據本發明實施例,適用於數位線性調節器的功率金屬氧化物半導體陣列包含複數金屬氧化物半導體電路。每一金屬氧化物半導體電路包含第一金屬氧化物半導體電晶體與第二金屬氧化物半導體電晶體,其電性串聯於電源與數位線性調節器的輸出節點之間。其中第一金屬氧化物半導體電晶體作為電流源,受控於輸出節點的輸出電壓。According to an embodiment of the present invention, a power metal oxide semiconductor array suitable for a digital linear regulator includes a plurality of metal oxide semiconductor circuits. Each metal oxide semiconductor circuit includes a first metal oxide semiconductor transistor and a second metal oxide semiconductor transistor, which are electrically connected in series between the power supply and the output node of the digital linear regulator. The first metal oxide semiconductor transistor as a current source is controlled by the output voltage of the output node.
第一A圖顯示本發明實施例之具動態電流源功率金屬氧化物半導體(MOS)陣列的數位線性調節器(regulator)100的方塊圖,第一B圖例示部分第一A圖的細部方塊圖。本實施例之數位線性調節器100可適用於單晶片系統(system on chip)以提供個別電壓。FIG. 1A shows a block diagram of a digital
在本實施例中,數位線性調節器100可包含微調迴路(fine-loop)控制器11及微調功率金屬氧化物半導體陣列(以下簡稱微調功率陣列)12。於穩態(steady state),數位線性調節器100的調節輸出電壓Vout為穩定的,微調迴路控制器11可開啟微調功率陣列12,其包含有複數微調功率金屬氧化物半導體電晶體,以產生輸出電壓Vout。負載10連接於輸出電壓Vout與地之間,以接收輸出電壓Vout。In this embodiment, the digital
數位線性調節器100可包含粗調迴路(coarse-loop)控制器13及粗調功率金屬氧化物半導體陣列(以下簡稱粗調功率陣列)14。於暫態(transient state或不穩態),數位線性調節器100的調節輸出電壓Vout為不穩定的,粗調迴路控制器13可開啟粗調功率陣列14,其包含有複數粗調功率金屬氧化物半導體電晶體,以產生輸出電壓Vout。一般來說,粗調功率陣列14的粗調功率金屬氧化物半導體電晶體之尺寸大於微調功率陣列12的微調功率金屬氧化物半導體電晶體。The digital
本實施例之數位線性調節器100可包含類比至數位轉換器(ADC)暨狀態電路15,用以進行類比至數位轉換,且根據輸出電壓Vout以決定數位線性調節器100的目前狀態(亦即穩態或暫態)。The digital
本實施例之類比至數位轉換器暨狀態電路15可包含比較器151,其接收數位線性調節器100的輸出電壓Vout與(預設)參考電壓Vref,據以產生比較信號Vcomp
。類比至數位轉換器暨狀態電路15可包含類比至數位轉換器(ADC)152,用以產生(數位)類比至數位轉換輸出,其為輸出電壓Vout與參考電壓Vref的差值。類比至數位轉換器暨狀態電路15可包含狀態電路153,其根據類比至數位轉換輸出以產生事件信號ENT,以代表目前狀態。The analog-to-digital converter and
本實施例之微調迴路控制器11主要包含微調迴路移位暫存器111,其接收比較信號Vcomp
,據以產生微調移位輸出F。微調迴路移位暫存器111可包含串聯的正反器(flip flop)(未顯示於圖式),受控於第一時脈信號CLK_f。根據本實施例的特徵之一,微調迴路移位暫存器111可被事件信號ENT開啟,於穩態期間可節省功率。當事件信號ENT為非主動(de-asserted)時,表示輸出電壓Vout為穩定的穩態,則開啟微調迴路移位暫存器111。The
本實施例之粗調迴路控制器13主要包含粗調迴路移位暫存器131,其接收比較信號Vcomp
,據以產生粗調移位輸出C。粗調迴路移位暫存器131可接收類比至數位轉換輸出以加速位移。粗調迴路移位暫存器131可包含串聯的正反器(flip flop)(未顯示於圖式),受控於第二時脈信號CLK_c,其快於第一時脈信號CLK_f。根據本實施例的另一特徵,粗調迴路移位暫存器131可被事件信號ENT關閉,於穩態期間可節省功率。當事件信號ENT為主動(asserted)時,表示輸出電壓Vout為不穩定的暫態,則開啟粗調迴路移位暫存器131。另一方面,當事件信號ENT為非主動(de-asserted)時,表示輸出電壓Vout為穩定的穩態,則關閉粗調迴路移位暫存器131。The coarse adjustment loop controller 13 of this embodiment mainly includes a coarse adjustment loop shift register 131, which receives the comparison signal V comp and accordingly generates a coarse adjustment shift output C. The coarse
第二A圖顯示第一A圖之微調功率陣列12的電路圖。微調功率陣列12(自微調迴路移位暫存器111)接收微調移位輸出F,據以產生輸出電壓Vout。在本實施例中,微調功率陣列12可包含複數併聯的金屬氧化物半導體電晶體M0,例如P型金屬氧化物半導體電晶體(PMOS),其源極分別電性連接至電源Vdd,其汲極分別電性連接至輸出節點,其提供輸出電壓Vout。金屬氧化物半導體電晶體M0的閘極分別電性連接微調移位輸出F的位元。The second diagram A shows the circuit diagram of the fine-
第二B圖顯示第一A圖之粗調功率陣列14的電路圖。粗調功率陣列14(自粗調迴路移位暫存器131)接收粗調移位輸出C,據以產生輸出電壓Vout。在本實施例中,粗調功率陣列14可包含複數金屬氧化物半導體電路141。根據本實施例的另一特徵,每一金屬氧化物半導體電路141可包含第一金屬氧化物半導體電晶體(例如P型金屬氧化物半導體電晶體)M1與第二金屬氧化物半導體電晶體(例如P型金屬氧化物半導體電晶體)M2,其電性串聯於電源Vdd與輸出節點(其提供輸出電壓Vout)之間。其中,第一金屬氧化物半導體電晶體M1的源極電性連接至電源Vdd,其汲極電性連接至第二金屬氧化物半導體電晶體M2的源極,其閘極電性連接至第二金屬氧化物半導體電晶體M2的汲極與輸出節點(其提供輸出電壓Vout)。第二金屬氧化物半導體電晶體M2的閘極分別電性連接粗調移位輸出C的位元。在另一實施例中,微調功率陣列12也可使用第二B圖的電路架構。The second figure B shows the circuit diagram of the coarse
第二C圖顯示第二B圖之金屬氧化物半導體電路141的等效電路。在本實施例中,第一金屬氧化物半導體電晶體M1作為電流源,受控於輸出電壓Vout。第一金屬氧化物半導體電晶體M1提供源極至汲極電流ISD(M1)
,流向輸出節點(其提供輸出電壓Vout)。負載10因此得到負載電流Iload
,其包含所有金屬氧化物半導體電路141所提供的源極至汲極電流ISD(M1)
。於上升(up)暫態時(亦即負載電流Iload
從低變為高),若輸出電壓Vout下降,則電流源(亦即第一金屬氧化物半導體電晶體M1)因阻抗減少而提供更多的源極至汲極電流ISD(M1)
,且輸出電壓Vout的下衝(undershoot)可減少。此外,輸出電壓Vout可因此於短時間從非穩定狀態回復。另一方面,於下降(down)暫態時(亦即負載電流Iload
從高變為低),若輸出電壓Vout上升,則電流源(亦即第一金屬氧化物半導體電晶體M1)因阻抗增加而提供更少的源極至汲極電流ISD(M1)
,且輸出電壓Vout的過衝(overshoot)可減少。此外,輸出電壓Vout可因此於短時間從非穩定狀態回復。The second diagram C shows the equivalent circuit of the metal
第三圖顯示第一B圖之數位線性調節器100的相關信號的波形。於狀態1(亦即穩態),輸出電壓Vout為穩定,其振幅位於電壓視窗(Vref±ΔV)內。於穩態,關閉粗調迴路移位暫存器131,但開啟微調迴路移位暫存器111以啟動微調功率陣列12,用以提供輸出電壓Vout。一般來說,微調功率陣列12(及微調迴路移位暫存器111)較粗調功率陣列14(及粗調迴路移位暫存器131)的操作速度慢、消耗較少功率且產生較高輸出電壓精準度。由於微調功率陣列12(及微調迴路移位暫存器111)消耗較少功率,數位線性調節器100因此可以降低長期的功率消耗。The third diagram shows the waveform of the related signal of the digital
於狀態2(亦即暫態),輸出電壓Vout為不穩定,其過衝(overshoot)或下衝(undershoot)電壓超出電壓視窗(Vref±ΔV)。於暫態,關閉微調迴路移位暫存器111,但開啟粗調迴路移位暫存器131以啟動粗調功率陣列14,用以提供輸出電壓Vout。由於粗調功率陣列14(及粗調迴路移位暫存器131)的操作速度快,輸出電壓Vout因此可以於短時間從非穩定情況回復。In state 2 (that is, transient state), the output voltage Vout is unstable, and its overshoot or undershoot voltage exceeds the voltage window (Vref±ΔV). In the transient state, the fine-tuning
根據上述實施例,數位線性調節器100提供雙迴路控制機制以產生輸出電壓Vout。其中,於穩態,微調功率陣列12及微調迴路控制器11形成微調迴路,其具有較低的功耗與較高的輸出電壓精準度。另一方面,於暫態,粗調功率陣列14及粗調迴路控制器13形成粗調迴路,其具有較快的操作速度。According to the above embodiment, the digital
第四圖顯示第二B圖之粗調功率陣列14的相關信號的波形。根據本實施例之粗調功率陣列14的特徵之一,第一金屬氧化物半導體電晶體M1作為電流源,受控於輸出電壓Vout。第四圖的虛線顯示粗調功率陣列14未使用第一金屬氧化物半導體電晶體M1的相關信號的波形。根據本實施例,與數位線性調節器100相同接地的其他電路不會受到數位線性調節器100的干擾。The fourth diagram shows the waveforms of the related signals of the coarse
以上所述僅為本發明之較佳實施例而已,並非用以限定本發明之申請專利範圍;凡其它未脫離發明所揭示之精神下所完成之等效改變或修飾,均應包含在下述之申請專利範圍內。The above are only the preferred embodiments of the present invention and are not intended to limit the scope of the patent application of the present invention; all other equivalent changes or modifications made without departing from the spirit of the invention should be included in the following Within the scope of patent application.
100:數位線性調節器10:負載11:微調迴路控制器111:微調迴路移位暫存器12:微調功率金屬氧化物半導體陣列13:粗調迴路控制器131:粗調迴路移位暫存器14:粗調功率金屬氧化物半導體陣列141:金屬氧化物半導體電路15:類比至數位轉換器暨狀態電路151:比較器152:類比至數位轉換器MOS:金屬氧化物半導體Vout:輸出電壓Vref:參考電壓Vcomp:比較信號ENT:事件信號CLK_f:第一時脈信號CLK_c:第二時脈信號F:微調移位輸出C:粗調移位輸出M0:金屬氧化物半導體電晶體M1:第一金屬氧化物半導體電晶體M2:第二金屬氧化物半導體電晶體Vdd:電源ISD(M1):源極至汲極電流Iload:負載電流100: digital linear regulator 10: load 11: trimming loop controller 111: trimming loop shift register 12: trimming power metal oxide semiconductor array 13: coarse tuning loop controller 131: coarse tuning loop shift register 14: Coarse adjustment power metal oxide semiconductor array 141: metal oxide semiconductor circuit 15: analog to digital converter and state circuit 151: comparator 152: analog to digital converter MOS: metal oxide semiconductor Vout: output voltage Vref: Reference voltage V comp : comparison signal ENT: event signal CLK_f: first clock signal CLK_c: second clock signal F: fine-tuned shift output C: coarse-tuned shift output M0: metal oxide semiconductor transistor M1: first Metal oxide semiconductor transistor M2: second metal oxide semiconductor transistor Vdd: power supply I SD (M1) : source to drain current I load : load current
第一A圖顯示本發明實施例之具動態電流源功率金屬氧化物半導體(MOS)陣列的數位線性調節器的方塊圖。 第一B圖例示部分第一A圖的細部方塊圖。 第二A圖顯示第一A圖之微調功率陣列的電路圖。 第二B圖顯示第一A圖之粗調功率陣列的電路圖。 第二C圖顯示第二B圖之金屬氧化物半導體電路的等效電路。 第三圖顯示第一B圖之數位線性調節器的相關信號的波形。 第四圖顯示第二B圖之粗調功率陣列的相關信號的波形。FIG. 1A shows a block diagram of a digital linear regulator with a dynamic current source power metal oxide semiconductor (MOS) array according to an embodiment of the invention. The first figure B illustrates a detailed block diagram of part of the first figure A. The second figure A shows the circuit diagram of the fine-tuned power array of the first figure A. The second diagram B shows the circuit diagram of the coarse adjustment power array of the first diagram A. The second diagram C shows the equivalent circuit of the metal oxide semiconductor circuit of the second diagram B. The third diagram shows the waveform of the related signal of the digital linear regulator in the first diagram B. The fourth diagram shows the waveforms of the related signals of the coarse power array of the second diagram B.
10:負載 10: load
14:粗調功率金屬氧化物半導體陣列 14: Coarse tuning power metal oxide semiconductor array
141:金屬氧化物半導體電路 141: Metal oxide semiconductor circuit
Vout:輸出電壓 Vout: output voltage
C:粗調移位輸出 C: Coarse adjustment shift output
M1:第一金屬氧化物半導體電晶體 M1: the first metal oxide semiconductor transistor
M2:第二金屬氧化物半導體電晶體 M2: Second metal oxide semiconductor transistor
Vdd:電源 Vdd: power supply
ISD(M1):源極至汲極電流 I SD(M1) : source to drain current
Iload:負載電流 I load : load current
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TWI415373B (en) * | 2010-02-08 | 2013-11-11 | Sitronix Technology Corp | Dead state adjustment circuit and method with coarse adjustment function and fine adjustment function |
US8588289B2 (en) * | 2010-07-19 | 2013-11-19 | National Semiconductor Corporation | Adaptive signal equalizer with segmented coarse and fine controls |
US9263998B2 (en) * | 2013-12-16 | 2016-02-16 | Mstar Semiconductor, Inc. | Broadband single-ended input to differential output low-noise amplifier |
US10044263B2 (en) * | 2015-03-12 | 2018-08-07 | Microchip Technology Incorporated | Using PMOS power switch in a combination switching and linear regulator |
WO2017019981A1 (en) * | 2015-07-30 | 2017-02-02 | Circuit Seed, Llc | Reference generator and current source transistor based on complementary current field-effect transistor devices |
-
2018
- 2018-10-17 TW TW107136551A patent/TWI678061B/en active
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