TW202012285A - Electronic component stabilizing device and appearance inspection apparatus therefor - Google Patents
Electronic component stabilizing device and appearance inspection apparatus therefor Download PDFInfo
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- TW202012285A TW202012285A TW107139755A TW107139755A TW202012285A TW 202012285 A TW202012285 A TW 202012285A TW 107139755 A TW107139755 A TW 107139755A TW 107139755 A TW107139755 A TW 107139755A TW 202012285 A TW202012285 A TW 202012285A
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- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
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- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
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- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
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- B07C5/342—Sorting according to other particular properties according to optical properties, e.g. colour
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Abstract
Description
本案係關於一種電子元件穩定裝置,尤指一種適用於外觀檢測設備之電子元件穩定裝置。This case is about an electronic component stabilization device, especially an electronic component stabilization device suitable for appearance inspection equipment.
現有的電子元件外觀檢測設備一般是藉由震動盤將電子元件整列後,排列至一旋轉盤上,旋轉盤將電子元件輸送至鏡頭前取像以供檢測外觀,再藉由一集料裝置依據檢測結果分類收集。Existing electronic component appearance inspection equipment generally arranges the electronic components by vibrating discs and arranges them on a rotating disc. The rotating discs transport the electronic components to the front of the lens to take an image for inspection of appearance. The test results are collected separately.
第1圖顯示現行外觀檢測設備之輸送機制示意圖,第2圖顯示第1圖落料處之局部剖面圖。如第1圖及第2圖所示,現行外觀檢測設備包含供料裝置11、下料軌道12、低震動塊13、玻璃圓盤14及導料塊15。供料裝置11將電子元件10經下料軌道12送出,且下料軌道12底部設置有低震動塊13,係由固定螺絲131鎖固於下料軌道12下方,提供承接電子元件10由下料軌道12落於玻璃圓盤14的橋樑。當電子元件10由下料軌道12震動前進落到低震動塊13後,低震動塊13上的電子元件10經由後方推擠前進掉落到旋轉的玻璃圓盤14上,玻璃圓盤14承接落下的電子元件10,且玻璃圓盤14之線速度大於下料軌道12送料的速度,使電子元件10落至玻璃圓盤14上後,可拉開彼此間距,以利後端之鏡頭取像進行外觀檢測,最後再將電子元件10收集至集料裝置16中。Figure 1 shows a schematic diagram of the conveying mechanism of the current appearance inspection equipment, and Figure 2 shows a partial cross-sectional view of the blanking place in Figure 1. As shown in FIG. 1 and FIG. 2, the current appearance inspection equipment includes a
由於玻璃圓盤14旋轉的速度大於下料軌道12送料的速度,使得電子元件10落於玻璃圓盤14上容易有落料歪斜不穩定的問題,故玻璃圓盤14上方另設置有導料塊15,其係固設於落料處附近且具有弧面,藉由玻璃圓盤14之旋轉,電子元件10邊緣碰觸到導料塊14之弧面,進而使電子元件10導正於一切線方向上。Since the rotating speed of the
此習知技術對於玻璃圓盤14在低轉速(5rpm以下)產能之外觀檢測設備而言,可以克服材料歪斜不穩定問題,但當玻璃圓盤14的轉速大於目前產能轉速二倍以上時,材料歪斜不穩定問題即無法克服,且歪斜比例會隨轉速增加而升高。This conventional technology can overcome the problem of material skew and instability for the appearance inspection equipment of the
此外,習知技術為了將電子元件10吸附在玻璃圓盤14以利輸送,會使玻璃圓盤14帶電,以使電子元件10透過靜電吸附力吸附在玻璃圓盤14。然而無論是透過靜電刷、電離器或導電板等裝置來提供靜電,皆會使得設備成本提高,且操作人員也可能被靜電電到而有安全性的問題。此外,靜電提供裝置也容易沾黏灰塵,從而增加清潔的難度。In addition, in the conventional technology, in order to attract the
因此,為了改善習知技術之缺失,實有必要提供一種電子元件穩定裝置,以克服落料歪斜不穩定的問題,進而提升外觀檢測設備的產能。Therefore, in order to improve the lack of conventional technology, it is necessary to provide an electronic component stabilization device to overcome the problem of unstable blanking and skew, thereby improving the productivity of appearance inspection equipment.
本案之目的在於提供一種電子元件穩定裝置及其適用之外觀檢測設備,其係架構於提升落料穩定度,克服習知技術落料歪斜不穩定的問題,進而提升外觀檢測設備的產能。The purpose of this case is to provide an electronic component stabilization device and its applicable appearance inspection equipment, which is based on improving the blanking stability, overcoming the problem of the instability of the blanking skew of the conventional technology, and thereby increasing the productivity of the appearance inspection equipment.
本案之另一目的在於提供一種電子元件穩定裝置及其適用之外觀檢測設備,可藉由落料穩定度的提升而免除靜電提供裝置之配置,故可降低設備成本、增加操作人員之安全性、及避免靜電提供裝置之清潔問題。Another object of this case is to provide an electronic component stabilization device and its applicable appearance inspection equipment, which can eliminate the configuration of the static electricity supply device by improving the blanking stability, so it can reduce equipment costs, increase the safety of operators, And avoid the problem of cleaning the static electricity supply device.
為達上述目的,本案提供一種電子元件穩定裝置,適用於一外觀檢測設備。外觀檢測設備包含一下料軌道及一旋轉盤,旋轉盤係承載由下料軌道落下之複數個電子元件並使複數個電子元件沿一材料行走線移動。電子元件穩定裝置包含:一導料輪,設置於材料行走線之外側,且具有一圓弧面;一馬達,與導料輪連接,以驅動導料輪之旋轉;以及一負壓產生器,設置於導料輪之底部,並架構於產生一吸力,使得自下料軌道落下之每一電子元件被吸往導料輪而貼附於導料輪之圓弧面,並隨著導料輪之旋轉而往前推送。其中,導料輪之線速度與電子元件在旋轉盤上的行走線速度相同,當電子元件不再受負壓產生器之吸力吸引而脫離導料輪時,電子元件可穩定地於旋轉盤上沿著材料行走線前進。To achieve the above purpose, this case provides an electronic component stabilizing device, which is suitable for an appearance inspection device. The appearance inspection equipment includes a material discharging track and a rotating disc, which carries a plurality of electronic components falling from the material discharging track and moves the plurality of electronic components along a material walking line. The electronic component stabilization device includes: a material guide wheel, which is arranged outside the material walking line, and has a circular arc surface; a motor is connected to the material guide wheel to drive the rotation of the material guide wheel; and a negative pressure generator, It is arranged at the bottom of the guide wheel and is constructed to generate a suction force, so that each electronic component falling from the feeding track is sucked to the guide wheel and attached to the arc surface of the guide wheel, and follows the guide wheel Rotate and push forward. Among them, the linear speed of the guide wheel is the same as the linear speed of the electronic component on the rotating disc. When the electronic component is no longer attracted by the suction of the negative pressure generator and is separated from the guide wheel, the electronic component can be stably on the rotating disc Follow the material walking line.
在一實施例中,電子元件穩定裝置係設置於下料軌道之末端出口處。In one embodiment, the electronic component stabilizing device is disposed at the end exit of the blanking track.
在一實施例中,導料輪之圓弧面與材料行走線外切。In one embodiment, the arc surface of the material guide wheel is tangent to the material travel line.
在一實施例中,導料輪之旋轉方向與旋轉盤之旋轉方向相反。In one embodiment, the direction of rotation of the guide wheel is opposite to the direction of rotation of the rotating disc.
在一實施例中,導料輪之底部與旋轉盤表面之間隙為電子元件厚度的1/3至2/3。In one embodiment, the gap between the bottom of the guide wheel and the surface of the rotating disk is 1/3 to 2/3 of the thickness of the electronic component.
在一實施例中,負壓產生器包含一管道,管道配置方向大致與材料行走線之切線方向垂直。In one embodiment, the negative pressure generator includes a pipe, and the pipe arrangement direction is substantially perpendicular to the tangent direction of the material travel line.
在一實施例中,管道於靠近電子元件落下處之一端具有一開口。In one embodiment, the tube has an opening near the end where the electronic component drops.
在一實施例中,導料輪之圓弧面對應管道之開口處與下料軌道末端出口之間的距離大致等於電子元件之長度。In one embodiment, the distance between the arc surface of the guide wheel corresponding to the opening of the pipe and the outlet of the end of the blanking track is approximately equal to the length of the electronic component.
在一實施例中,當電子元件脫離導料輪時,電子元件之縱向與材料行走線之夾角約為0至15度。In one embodiment, when the electronic component is separated from the material guide wheel, the angle between the longitudinal direction of the electronic component and the material travel line is about 0 to 15 degrees.
在一實施例中,負壓產生器為一真空管裝置。In one embodiment, the negative pressure generator is a vacuum tube device.
為達上述目的,本案提供一種外觀檢測設備,包含一供料裝置、一旋轉盤、一電子元件穩定裝置、複數個取像裝置及一集料裝置。供料裝置具有一下料軌道,架構於推送複數個電子元件。旋轉盤架構於承載由下料軌道落下之複數個電子元件,並使複數個電子元件沿一材料行走線移動。電子元件穩定裝置包含:一導料輪,設置於材料行走線之外側,且具有一圓弧面;一馬達,與導料輪連接,以驅動導料輪之旋轉;以及一負壓產生器,設置於導料輪之底部,並架構於產生一吸力,使得自下料軌道落下之每一電子元件被吸往導料輪,而貼附於導料輪之圓弧面,並隨著導料輪之旋轉而往前推送;其中,導料輪之線速度與電子元件在旋轉盤上的行走線速度相同,當電子元件不再受負壓產生器之吸力吸引而脫離導料輪時,電子元件可穩定地於旋轉盤上沿著材料行走線前進。複數個取像裝置架構於擷取電子元件各視角的影像以進行外觀檢測。集料裝置架構於根據外觀檢測結果收集電子元件。To achieve the above purpose, the present case provides an appearance inspection device, which includes a feeding device, a rotating disk, an electronic component stabilizing device, a plurality of image capturing devices, and a collecting device. The feeding device has a feeding track, which is based on pushing a plurality of electronic components. The rotating disc structure carries a plurality of electronic components falling from the blanking track, and moves the plurality of electronic components along a material walking line. The electronic component stabilization device includes: a material guide wheel, which is arranged outside the material walking line, and has a circular arc surface; a motor is connected to the material guide wheel to drive the rotation of the material guide wheel; and a negative pressure generator, It is installed at the bottom of the guide wheel and is constructed to generate a suction force, so that each electronic component falling from the blanking track is attracted to the guide wheel, and is attached to the arc surface of the guide wheel and follows the guide The wheel rotates and pushes forward; where the linear speed of the guide wheel is the same as the linear speed of the electronic component walking on the rotating disc. When the electronic component is no longer attracted by the suction of the negative pressure generator and leaves the guide wheel, the electronic The element can be stably advanced along the material walking line on the rotating disc. A plurality of image capturing devices are based on capturing images from various viewing angles of electronic components for visual inspection. The aggregate device is configured to collect electronic components based on the appearance inspection results.
在一實施例中,外觀檢測設備更包含一導料裝置,其係設置於電子元件穩定裝置之下游。In one embodiment, the appearance inspection device further includes a material guiding device, which is disposed downstream of the electronic component stabilizing device.
在一實施例中,導料裝置包含一導料塊,係設置於材料行走線之內側,且具有一圓弧面。In one embodiment, the material guiding device includes a material guiding block, which is disposed inside the material walking line and has a circular arc surface.
體現本案特徵與優點的一些實施例將在後段的說明中詳細敘述。應理解的是本案能夠在不同的態樣上具有各種的變化,其皆不脫離本案的範圍,且其中的說明及圖式在本質上為說明之用,而非用以限制本案。Some embodiments embodying the features and advantages of this case will be described in detail in the following paragraphs. It should be understood that this case can have various changes in different forms, and all of them do not deviate from the scope of this case, and the descriptions and drawings therein are essentially for illustrative purposes, rather than to limit this case.
本案主要提供一種電子元件穩定裝置,適用於外觀檢測設備,並架構於提升落料穩定度,進而提升外觀檢測設備的產能。第3圖及第4圖顯示本案之外觀檢測設備之不同視角示意圖。如第3圖及第4圖所示,外觀檢測設備2包含輸送裝置3、供料裝置4、電子元件穩定裝置5、取像裝置6及集料裝置7,該等裝置皆設置於外觀檢測設備2之基座21上。This case mainly provides an electronic component stabilization device, which is suitable for appearance inspection equipment and is structured to improve the blanking stability, thereby enhancing the productivity of appearance inspection equipment. Figures 3 and 4 show different perspective views of the appearance inspection device of this case. As shown in FIGS. 3 and 4, the
輸送裝置3包含旋轉盤31及馬達32。在一實施例中,旋轉盤31為玻璃製的圓環狀透明盤,旋轉盤31呈水平配置且動力連接於馬達32,藉此能夠被馬達32驅動而水平旋轉,且作為電子元件10之承載平台,經由旋轉使電子元件10移動至取像裝置6各站進行外觀檢測,以及移動至集料裝置7進行最後的集料作業。其中,電子元件10隨旋轉盤31移動之路徑定義為材料行走線(如第6圖旋轉盤31上之虛線所示),其係為半徑略小於旋轉盤31半徑之圓形路徑。The
供料裝置4包含震動盤41及下料軌道42。在一實施例中,震動盤41為一圓盤,架構於藉由環形震動將電子元件10自盤心依圓盤螺旋路徑移載,依序排列至最外緣路徑而進入下料軌道42。下料軌道42連接於震動盤41,其為一直線凹型溝槽,可承載電子元件10並使電子元件10形成一直線排列,以及推送電子元件10直線前進落下至旋轉盤31上。下料軌道42的末端延伸至靠近但不接觸旋轉盤31之表面,且下料軌道42較佳地沿著旋轉盤31旋轉方向之切線方向配置。The
外觀檢測設備2包含複數個環繞旋轉盤31配置的取像裝置6,且各取像裝置6分別依據不同的取像角度而以不同的角度鄰近旋轉盤31配置。各取像裝置6包含攝影鏡頭61及直立滑軌62,攝影鏡頭61係可滑動地設置於直立滑軌62上,並架構於擷取電子元件10各視角的影像以進行外觀檢測。取像裝置6也可以視需求而更包含反射鏡,其對應旋轉盤31配置藉以反映旋轉盤31上承載的電子元件10,以供攝影鏡頭61擷取電子元件10的影像;藉由反射鏡的設置,可減少取像裝置6配置於旋轉盤31上的數量。The
集料裝置7包含複數個集料盒71以及對應複數個集料盒71的複數個吹嘴72,各吹嘴72朝向相對應的集料盒71配置,且分別連接可調整壓力之穩定正壓氣源。各吹嘴72上分別設置有電磁閥,各電磁閥分別電性連接控制器,故控制器能夠藉由電磁閥控制各吹嘴72吹氣之時間點,藉此依據各電子元件10的檢測結果將各電子元件10分別吹入對應的集料盒71中。在一實施例中,集料裝置7包含四個集料盒71,其中兩個集料盒71係收集檢測為不良的電子元件10,且可設定為收集不良程度不同的電子元件10 (例如:一個集料盒71負責收集外觀有受損的電子元件10、另一個集料盒71負責收集外觀電鍍有不均勻的電子元件10,此等電鍍不均勻之電子元件10後續可以重新電鍍加工再重新進行檢測後利用),一個集料盒71係收集檢測為合格的電子元件10,另一個集料盒71則收集需要重測的電子元件10,例如未成功取像的電子元件10。當然,集料盒71之數量及用途配置可依不同需求調整而不受限於前述實施例。The
為了能有效取得電子元件10各視角的影像,電子元件10在旋轉盤31上須保持一定間距以方便取像裝置6之攝影鏡頭61進行取像,故旋轉盤31之轉速必然會大於電子元件10的落料速度,以拉開電子元件10彼此的間距。因此,當電子元件10落至轉速較快之旋轉盤31上時,難免產生歪斜現象而影響後端取像品質。故為了改善此缺失,本案之外觀檢測設備2更包含電子元件穩定裝置5,其架構於增加落料的穩定度,以進行有效的外觀檢測。In order to effectively obtain images from various viewing angles of the
第5圖至第8圖顯示外觀檢測設備之局部結構及所承載之電子元件示意圖,以清楚闡釋本案電子元件穩定裝置之設計。請同時參閱第3圖至第8圖。電子元件穩定裝置5係設置於下料軌道42之末端出口處(亦即落料處),並設置於旋轉盤31之材料行走線(如旋轉盤31上之圓形虛線所示)之外側。電子元件穩定裝置5包含導料輪51、馬達52及負壓產生器53。導料輪51大致呈圓盤狀,與旋轉盤31同樣呈水平配置且動力連接於馬達52,藉此能夠被馬達52驅動而水平旋轉。導料輪51係設置於材料行走線之外側,且具有光滑的圓弧面511。在一實施例中,圓弧面511與材料行走線外切。當電子元件10碰觸到導料輪51之圓弧面511時,便可隨著導料輪51之旋轉而被引導依序排列於材料行走線上。Figure 5 to Figure 8 show the partial structure of the appearance inspection equipment and the schematic diagram of the electronic components carried to clearly explain the design of the electronic component stabilization device in this case. Please also refer to Figure 3 to Figure 8. The electronic
在一實施例中,導料輪51之圓弧面511切線速度與旋轉盤31承載電子元件10位置接觸面之切線速度相同,換言之,導料輪51之旋轉線速度V2與電子元件10在旋轉盤31上的行走線速度V1相同,故可穩定前後顆材料之間距。又,導料輪51之旋轉方向與旋轉盤31之旋轉方向相反,例如,旋轉盤31以逆時針方向旋轉而導料輪51以順時針方向旋轉,以將電子元件10帶離落料處朝取像裝置6移動。抑或是,當下料軌道42之配置方向變換時,亦可使旋轉盤31改以逆時針方向旋轉而導料輪51改以順時針方向旋轉。In one embodiment, the tangent speed of the
在一實施例中,導料輪51之底部與旋轉盤31表面之間隙H約為電子元件10厚度的1/3至2/3,以使電子元件10可抵靠於導料輪51之圓弧面511而不致落入導料輪51之底部。In one embodiment, the gap H between the bottom of the
負壓產生器53設置於導料輪51之底部,但不會隨著導料輪51旋轉。在一實施例中,負壓產生器53設置於靠近下料軌道42末端出口之一側。負壓產生器53包含一管道531,管道531配置方向大致與材料行走線之切線方向垂直,且管道531於靠近落料處之一端具有開口532。當負壓產生器53利用例如抽吸方式於管道531形成負壓時,將經由開口532產生一吸力,使得自下料軌道42落下之電子元件10被吸往導料輪51,而貼附於導料輪51之圓弧面511及旋轉盤31之表面,並隨著導料輪51之旋轉而往前推送。由於導料輪51之圓弧面511切線速度與旋轉盤31承載電子元件10位置接觸面之切線速度相同,當電子元件10不再受負壓產生器53之吸力吸引而脫離導料輪51時,電子元件10前進速度與旋轉盤31承載電子元件10位置接觸面之切線速度相同,即可穩定地於旋轉盤31上沿著材料行走線前進,故可進一步提升落料穩定度。The
在一實施例中,當電子元件10脫離導料輪51時,電子元件10之縱向與材料行走線之夾角q維持在約0至15度之角度範圍。In one embodiment, when the
在一實施例中,負壓產生器53可為真空管裝置,但不以此為限。In an embodiment, the
在一實施例中,導料輪51之圓弧面511對應負壓產生器53的管道531之開口532處與下料軌道42末端出口之間的距離W大致約為一顆材料的料距,亦即大致等同於電子元件10之長度,此距離W亦可隨著不同電子元件10的長度不同而進行調整。In one embodiment, the
在一實施例中,由於電子元件穩定裝置5提升了落料穩定度,使得下料軌道42末端也無須配置低震動塊。In one embodiment, since the electronic
在一實施例中,外觀檢測設備2可選擇性包含導料裝置8,設置於電子元件穩定裝置5之下游。導料裝置8包含一導料塊81,其設置於旋轉盤31之上方且位於材料行走線之內側。導料塊81於面向材料行走線之一側具有光滑的圓弧面811,當電子元件10邊緣碰觸導料塊81之圓弧面811時,亦可進一步使電子元件10導正於一切線方向上。此外,由於電子元件穩定裝置5已大致避免落料歪斜之問題,故當電子元件10脫離導料輪51時,絕大部分皆已導正排列於材料行走線上,故在一實施例中,外觀檢測設備2可無須設置導料裝置8。In an embodiment, the
綜上所述,藉由本案電子元件穩定裝置5之設計,當電子元件10自供料裝置4之下料軌道42出口落下至旋轉盤31之表面上時,電子元件10會先被負壓產生器53之吸力吸往導料輪51,而貼附於導料輪51並隨著導料輪51之旋轉而往前推送。由於導料輪51之線速度與電子元件10在旋轉盤31上的行走線速度相同,當電子元件10不再受負壓產生器53之吸力吸引而脫離導料輪51時,電子元件10即可穩定且導正地於旋轉盤31上沿著材料行走線前進。因此,本案電子元件穩定裝置5可進一步提升落料穩定度,克服習知技術落料歪斜不穩定的問題,使後端之取像裝置6可有效取像,提升外觀檢測設備2之檢測效能。另一方面,由於落料穩定度大幅提升,使得旋轉盤31之轉速亦可隨之提升至約5rpm至12rpm (較佳為10rpm至12rpm),進而增進外觀檢測設備2的產能,例如一分鐘可檢測達8000顆,甚至10000顆以上材料的產能,大大地提昇了外觀檢測設備2的工業應用價值。此外,藉由電子元件穩定裝置5之設計,本案之外觀檢測設備2無須採用靜電提供裝置來使電子元件10透過靜電吸附力吸附在旋轉盤31,故相較於具有靜電提供裝置之習知外觀檢測設備,本案之外觀檢測設備2更可降低設備成本、增加操作人員之安全性、及避免靜電提供裝置之清潔問題。In summary, by the design of the electronic
縱使本發明已由上述實施例詳細敘述而可由熟悉本技藝人士任施匠思而為諸般修飾,然皆不脫如附申請專利範圍所欲保護者。Even though the present invention has been described in detail by the above-mentioned embodiments and can be modified by any person skilled in the art, it can be modified in any way as long as it is attached to the scope of protection of the patent application.
10:電子元件11:供料裝置12:下料軌道13:低震動塊131:固定螺絲14:玻璃圓盤15:導料塊16:集料裝置2:外觀檢測設備21:基座3:輸送裝置31:旋轉盤32:馬達4:供料裝置41:震動盤42:下料軌道5:電子元件穩定裝置51:導料輪511:圓弧面52:馬達53:負壓產生器531:管道532:開口6:取像裝置61:攝影鏡頭62:直立滑軌7:集料裝置71:集料盒72:吹嘴8:導料裝置81:導料塊811:圓弧面V1:電子元件在旋轉盤上的行走線速度V2:導料輪之旋轉線速度H:導料輪之底部與旋轉盤表面之間隙q:電子元件與材料行走線之夾角W:負壓產生器之管道開口與下料軌道末端出口之間距10: Electronic components 11: Feeding device 12: Feeding rail 13: Low vibration block 131: Fixing screw 14: Glass disc 15: Guide block 16: Aggregate device 2: Appearance inspection device 21: Base 3: Conveying Device 31: rotating disk 32: motor 4: feeding device 41: vibrating disk 42: blanking track 5: electronic component stabilizing device 51: guide wheel 511: arc surface 52: motor 53: negative pressure generator 531: pipeline 532: opening 6: imaging device 61: photographic lens 62: upright slide 7: collecting device 71: collecting box 72: mouthpiece 8: guide device 81: guide block 811: arc surface V1: electronic component Traveling linear velocity on the rotating disc V2: rotating linear velocity of the guide wheel H: gap between the bottom of the guiding wheel and the surface of the rotating disc q: angle between the electronic component and the material walking line W: the pipe opening of the negative pressure generator and The distance between the exits of the end of the blanking track
第1圖顯示現行外觀檢測設備之輸送機制示意圖。 第2圖顯示第1圖落料處之局部剖面圖。 第3圖及第4圖顯示本案之外觀檢測設備之不同視角示意圖。 第5圖至第8圖顯示外觀檢測設備之局部結構及所承載之電子元件示意圖。Figure 1 shows a schematic diagram of the delivery mechanism of current appearance inspection equipment. Figure 2 shows a partial cross-sectional view of the blanking point in Figure 1. Figures 3 and 4 show different perspective views of the appearance inspection device of this case. Figure 5 to Figure 8 show the partial structure of the appearance inspection equipment and the schematic diagram of the electronic components carried.
10:電子元件 10: Electronic components
31:旋轉盤 31: Rotating disk
42:下料軌道 42: blanking track
51:導料輪 51: Guide wheel
511:圓弧面 511: Arc surface
52:馬達 52: Motor
53:負壓產生器 53: Negative pressure generator
531:管道 531: Pipeline
532:開口 532: opening
81:導料塊 81: Guide block
811:圓弧面 811: Arc surface
V1:電子元件在旋轉盤上的行走線速度 V1: Linear speed of electronic components on the rotating disk
V2:導料輪之旋轉線速度 V2: rotating linear speed of the guide wheel
θ:電子元件縱向與材料行走線之夾角 θ: the angle between the longitudinal direction of the electronic component and the material walking line
W:負壓產生器之管道開口與下料軌道末端出口之間距 W: The distance between the pipe opening of the negative pressure generator and the outlet of the end of the blanking track
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