JP2020050519A - Electronic element stabilizer and appearance inspection device to which the same is applied - Google Patents
Electronic element stabilizer and appearance inspection device to which the same is applied Download PDFInfo
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- JP2020050519A JP2020050519A JP2018211344A JP2018211344A JP2020050519A JP 2020050519 A JP2020050519 A JP 2020050519A JP 2018211344 A JP2018211344 A JP 2018211344A JP 2018211344 A JP2018211344 A JP 2018211344A JP 2020050519 A JP2020050519 A JP 2020050519A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/34—Sorting according to other particular properties
- B07C5/342—Sorting according to other particular properties according to optical properties, e.g. colour
- B07C5/3422—Sorting according to other particular properties according to optical properties, e.g. colour using video scanning devices, e.g. TV-cameras
Abstract
Description
本発明は、電子素子安定装置に関するものであり、特に、外観検測装置に適用される電子素子安定装置に関するものである。 The present invention relates to an electronic element stabilizer, and more particularly, to an electronic element stabilizer applied to an appearance inspection device.
従来の電子素子の外観検測装置は、一般的に、振動盤により電子素子を整列させた後、回転盤に配列させ、その後、外観を検測するように、回転盤は、電子素子をレンズ前に伝送して画像を撮り、収集装置により検測結果に基づいて分類し収集する。 A conventional electronic element appearance inspection device generally arranges the electronic elements by a vibrating plate, then arranges the electronic elements on a turntable, and then measures the appearance by rotating the electronic element with a lens. The images are transmitted and captured beforehand, and are collected and classified by the collection device based on the inspection results.
図１は、従来の外観検測装置の伝送メカニズムを示す概略図であり、図２は、図１の電子素子落下処の部分断面図である。図１と図２に示したように、従来の外観検測装置は、供給装置１１、フィードトラック１２、低振動ブロック１３、ガラス円盤１４、及びガイドブロック１５を含む。供給装置１１は、電子素子１０を、フィードトラック１２を介して送り出し、且つフィードトラック１２の底部に、固定ねじ１３１によりフィードトラック１２の下方にロックされる低振動ブロック１３が設けられ、電子素子１０を引き受けてフィードトラック１２からガラス円盤１４の上に落下させることを提供する。電子素子１０はフィードトラック１２から振動及び進行して低振動ブロック１３に落下した後、低振動ブロック１３上の電子素子１０は、後方を経由して押し付けて進行して回転しているガラス円盤１４上に落下し、ガラス円盤１４の線速度はフィードトラック１２の送り速度より大きく、後端のレンズが画像を取り込んで外観検測を行うようにするために、電子素子１０がガラス円盤１４に落下した後、同士の間隔を引き離すことができ、最後に電子素子１０をさらに収集装置１６に収集する。 FIG. 1 is a schematic view showing a transmission mechanism of a conventional appearance inspection device, and FIG. 2 is a partial cross-sectional view of an electronic element dropping station of FIG. As shown in FIGS. 1 and 2, the conventional appearance inspection device includes a supply device 11, a feed track 12, a low vibration block 13, a glass disk 14, and a guide block 15. The supply device 11 feeds the electronic element 10 through the feed track 12, and a low-vibration block 13 that is locked below the feed track 12 by a fixing screw 131 is provided at the bottom of the feed track 12. To fall from the feed track 12 onto the glass disk 14. After the electronic element 10 vibrates and advances from the feed track 12 and drops to the low vibration block 13, the electronic element 10 on the low vibration block 13 pushes via the rear and advances to rotate the rotating glass disk 14. The electronic element 10 falls onto the glass disk 14 so that the linear velocity of the glass disk 14 is higher than the feed speed of the feed track 12 and the rear end lens captures an image and performs an external inspection. After that, the distance between the electronic devices 10 can be separated, and finally, the electronic elements 10 are further collected in the collection device 16.
ガラス円盤１４の回転する速度がフィードトラック１２の送り速度より大きいため、電子素子１０のガラス円盤１４への落下において、落下が傾いて不安定になる問題が起こり易いため、ガラス円盤１４の上方にほかのガイドブロック１５が設けられる。このガイドブロック１５は、電子素子落下処の近傍に固定的に設置され、かつ弧面を備え、ガラス円盤１４の回転により電子素子１０のエッジがガイドブロック１４の弧面に触れられ、ひいては電子素子１０を接線の方向に校正する。 Since the rotating speed of the glass disk 14 is higher than the feed speed of the feed track 12, when the electronic element 10 is dropped onto the glass disk 14, a problem that the drop is inclined and becomes unstable tends to occur. Another guide block 15 is provided. The guide block 15 is fixedly installed in the vicinity of the electronic element dropping place and has an arc surface, and the edge of the electronic element 10 touches the arc surface of the guide block 14 by the rotation of the glass disk 14, and thus the electronic element Calibrate 10 in the tangential direction.
この従来技術は、ガラス円盤１４の低い回転速度（５ｒｐｍ以下）の効率における外観検測装置にとって、材料が傾く不安定な問題を克服することができるが、ガラス円盤１４の回転速度が通常の生産効率における回転速度の二倍以上である場合、材料が傾く不安定の問題を克服できず、傾斜比率は回転速度の増加に伴って上がる。 Although this prior art can overcome the problem of material tilting and instability for the appearance inspection device at the efficiency of the low rotation speed (5 rpm or less) of the glass disk 14, the rotation speed of the glass disk 14 is reduced to the normal production speed. If the rotation speed in efficiency is more than twice the rotation speed, the problem of instability in tilting the material cannot be overcome, and the tilt ratio increases with the rotation speed.
その他、従来技術は、電子素子１０を伝送し易くするようにガラス円盤１４に吸着させるために、電子素子１０を、静電吸着力を介してガラス円盤１４に吸着させるようにガラス円盤１４に帯電させる。しかし、たとえ静電ブラシ、電離装置、導電板等装置を介して静電を提供しても、いずれも装置のコストを向上させ、操作員が帯電及び感電する場合があるという安全性の問題がある。そして、静電提供装置にゴミが付着し易いので、清潔にすることの難しさを増加させる。 In addition, in the prior art, the glass disk 14 is charged so that the electronic element 10 is attracted to the glass disk 14 via an electrostatic attraction force so that the electronic element 10 is attracted to the glass disk 14 to facilitate transmission. Let it. However, even if static electricity is provided through a device such as an electrostatic brush, an ionization device, or a conductive plate, any of them increases the cost of the device and raises a safety problem that an operator may be charged and receive an electric shock. is there. Further, dust easily adheres to the static electricity providing device, thereby increasing the difficulty of cleaning.
そのため、従来技術の欠損を改善するために、電子素子落下処が傾くという不安定な問題を克服し、外観検測装置の効率を向上させる、電子素子安定装置を提供する必要があった。 Therefore, in order to improve the deficiency of the prior art, it has been necessary to provide an electronic element stabilizing device that overcomes the unstable problem of the electronic element dropping portion tilting and improves the efficiency of the appearance inspection device.
本発明の目的は、電子素子安定装置及びそれを適用する外観検測装置を提供することである。当該発明は、電子素子落下の安定度を向上させるように構成され、従来技術において電子素子落下が傾くという不安定な問題を克服し、外観検測装置の効率を向上させる。 An object of the present invention is to provide an electronic device stabilizing device and an appearance inspection device to which the device is applied. The present invention is configured to improve the stability of dropping an electronic element, overcomes the unstable problem of tilting the electronic element in the prior art, and improves the efficiency of the appearance inspection device.
本発明の他の目的は、電子素子安定装置及びそれを適用する外観検測装置を提供することである。当該発明は、電子素子落下の安定度の向上させることにより、静電提供装置の配置を無くすことができるため、装置のコストを低下させたり、操作員の安全性を増加したりすることができ、且つ静電提供装置の清潔問題を回避することができる。 Another object of the present invention is to provide an electronic device stabilizer and an appearance inspection device to which the same is applied. According to the present invention, by improving the stability of dropping the electronic element, the arrangement of the static electricity providing device can be eliminated, so that the cost of the device can be reduced and the safety of the operator can be increased. In addition, the problem of cleanliness of the static electricity providing device can be avoided.
上記目的を達成するために、本発明は、外観検測装置に適用される電子素子安定装置を提供する。外観検測装置は、フィードトラックと、回転盤とを含み、前記回転盤は、フィードトラックから落下する複数の電子素子を積載し、前記複数の電子素子を材料の走行ラインに沿って移動させる。電子素子安定装置は、ガイドホイールと、モータと、負圧発生器と、を含み、前記ガイドホイールは、前記材料の走行ラインの外側に設置され、かつ円弧面を有し、前記モータは、ガイドホイールの回転を駆動するようにガイドホイールと連接され、前記負圧発生器は、前記ガイドホイールの底部に設置され、かつフィードトラックから落下する各電子素子がガイドホイールに吸われてガイドホイールの円弧面に付着され、ガイドホイールの回転に伴って前に転送されるように吸引力を発生させるよう構成される。なお、ガイドホイールの線速度と電子素子の回転盤上の走行線速度は同じであり、電子素子がもはや負圧発生器の吸引力の吸引を受けずガイドホイールから脱離する場合、電子素子が回転盤上において材料の走行ラインに沿って安定的に前進することができる。 In order to achieve the above object, the present invention provides an electronic device stabilizer applied to an appearance inspection device. The appearance inspection device includes a feed track and a turntable, and the turntable carries a plurality of electronic elements falling from the feed track, and moves the plurality of electronic elements along a traveling line of the material. The electronic element stabilizer includes a guide wheel, a motor, and a negative pressure generator, wherein the guide wheel is installed outside a traveling line of the material, and has an arc surface, and the motor includes a guide. The negative pressure generator is connected to the guide wheel to drive the rotation of the wheel, and the negative pressure generator is installed at the bottom of the guide wheel, and each electronic element falling from the feed track is sucked by the guide wheel and the arc of the guide wheel is formed. Attached to the surface and configured to generate a suction force to be forwarded as the guide wheel rotates. Note that the linear velocity of the guide wheel is the same as the linear velocity of the electronic element on the turntable, and when the electronic element no longer receives the suction force of the negative pressure generator and separates from the guide wheel, the electronic element It is possible to stably advance along the traveling line of the material on the turntable.
一実施例において、電子素子安定装置は、フィードトラックの末端の出口に設置される。 In one embodiment, the electronic stabilizer is located at the exit at the end of the feed track.
一実施例において、ガイドホイールの円弧面と材料の走行ラインは外接する。 In one embodiment, the arcuate surface of the guide wheel and the running line of the material circumscribe.
一実施例において、ガイドホイールの回転方向と回転盤の回転方向は反対である。 In one embodiment, the direction of rotation of the guide wheel and the direction of rotation of the turntable are opposite.
一実施例において、ガイドホイールの底部と回転盤の表面との間隙は、電子素子の厚さの１／３乃至２／３である。 In one embodiment, the gap between the bottom of the guide wheel and the surface of the turntable is 1/3 to 2/3 of the thickness of the electronic device.
一実施例において、負圧発生器は、配置方向が材料の走行ラインの接線方向に略垂直である配管を含む。 In one embodiment, the negative pressure generator comprises a pipe whose orientation is substantially perpendicular to the tangential direction of the line of travel of the material.
一実施例において、配管は、電子素子の落下するところに近い一端に開口を有する。 In one embodiment, the tubing has an opening at one end near where the electronic element falls.
一実施例において、ガイドホイールの円弧面に対応する配管の開口とフィードトラックの末端の出口との間の距離は電子素子の長さと略等しい。 In one embodiment, the distance between the pipe opening corresponding to the arcuate surface of the guide wheel and the outlet at the end of the feed track is approximately equal to the length of the electronic element.
一実施例において、電子素子がガイドホイールから脱離する場合、電子素子の縦方向と材料の走行ラインとの夾角は約０〜１５度である。 In one embodiment, when the electronic device is detached from the guide wheel, the included angle between the longitudinal direction of the electronic device and the traveling line of the material is about 0 to 15 degrees.
一実施例において、負圧発生器は真空管装置である。 In one embodiment, the negative pressure generator is a vacuum tube device.
上記目的を達成するために、本発明は、供給装置と、回転盤と、電子素子安定装置と、複数の撮像装置及び収集装置を含む外観検測装置を提供する。供給装置は、フィードトラックを備え、かつ複数の電子素子を転送するように構成されている。回転盤は、フィードトラックから落下する複数の電子素子を積載し、かつ電子素子を材料の走行ラインに沿って移動させるように構成されている。電子素子安定装置は、材料の走行ラインの外側に設置され、かつ円弧面を備えるガイドホイールと、ガイドホイールの回転を駆動するようにガイドホイールと連接されるモータと、ガイドホイールの底部に設置され、かつフィードトラックから落下する各電子素子がガイドホイールに吸われてガイドホイールの円弧面に付着され、ガイドホイールの回転に伴って前に転送されるように吸引力を発生させるよう構成されている負圧発生器と、を含む。なお、ガイドホイールの線速度と電子素子の回転盤上の走行線速度は同じであり、電子素子がもはや負圧発生器の吸引力の吸引を受けずガイドホイールから脱離する場合、電子素子が回転盤上において材料の走行ラインに沿って安定的に前進することができる。複数の撮像装置は、外観検測を行うために電子素子の各視点の映像を撮るように構成されている。収集装置は、外観検測の結果に基づいて電子素子を収集するように構成されている。 In order to achieve the above object, the present invention provides a visual inspection device including a supply device, a turntable, an electronic element stabilizer, a plurality of imaging devices and a collection device. The supply device includes a feed track and is configured to transfer a plurality of electronic elements. The turntable is configured to load a plurality of electronic elements falling from a feed track and move the electronic elements along a traveling line of the material. The electronic element stabilizer is installed outside the running line of the material and has a guide wheel having an arc surface, a motor connected to the guide wheel to drive the rotation of the guide wheel, and installed at the bottom of the guide wheel. Also, each electronic element falling from the feed track is sucked by the guide wheel and attached to the arc surface of the guide wheel, and is configured to generate a suction force such that the electronic element is transferred forward with the rotation of the guide wheel. A negative pressure generator. Note that the linear velocity of the guide wheel is the same as the linear velocity of the electronic element on the turntable, and when the electronic element no longer receives the suction force of the negative pressure generator and separates from the guide wheel, the electronic element It is possible to stably advance along the traveling line of the material on the turntable. The plurality of imaging devices are configured to take images of each viewpoint of the electronic element in order to perform appearance inspection. The collecting device is configured to collect the electronic elements based on the result of the appearance inspection.
一実施例において、外観検測装置は、電子素子安定装置の下流側に設置されるガイド装置を含む。 In one embodiment, the visual inspection device includes a guide device installed downstream of the electronic device stabilizer.
一実施例において、ガイド装置は、材料の走行ラインの内側に設置され、かつ円弧面を有するガイドブロックを含む。 In one embodiment, the guide device includes a guide block installed inside the traveling line of the material and having an arc surface.
以下、本発明の特徴及び利点を示す典型的な実施例を詳しく説明する。理解されるべきであることは、本発明の異なる態様には様々な変化があり、何れも本発明の範囲に含まれ、それについての説明及び図面は本質的に説明するためのものであり、本発明を制限するものではない。 An exemplary embodiment illustrating the features and advantages of the present invention will now be described in detail. It should be understood that there are various changes to the different aspects of the invention, all of which fall within the scope of the invention, the description and drawings of which are intended to be exemplary only, It does not limit the invention.
本発明は、主に、外観検測装置に適用され、かつ電子素子落下の安定度を向上させるように構成され、外観検測装置の効率を向上させる電子素子安定装置を提供することである。図３及び図４は、本発明の外観検測装置の異なる視点からの概略図である。図３及び図４に示されるように、外観検測装置２は、伝送裝置３と、供給装置４と、電子素子安定裝置５と、撮像装置（ｉｍａｇｅ ｃａｐｔｕｒｉｎｇ ｄｅｖｉｃｅ）６及び収集装置７を含み、これらの装置は、いずれも外観検測装置２のベース２１上に設置される。 An object of the present invention is to provide an electronic device stabilizing device which is mainly applied to an appearance inspection device and is configured to improve the stability of dropping an electronic element, thereby improving the efficiency of the appearance inspection device. 3 and 4 are schematic views of the appearance inspection device of the present invention from different viewpoints. As shown in FIGS. 3 and 4, the appearance inspection device 2 includes a transmission device 3, a supply device 4, an electronic device stabilization device 5, an image capturing device 6, and a collection device 7. All of these devices are installed on the base 21 of the appearance inspection device 2.
伝送裝置３は、回転盤３１及びモータ３２を含む。一実施例において、回転盤３１は、ガラス製の円環状透明盤であり、回転盤３１は、水平に配置され、かつモータ３２と動力的に連接され、これによってモータ３２により駆動されて水平に回転し、かつ電子素子１０の積載プラットフォームとして、回転により電子素子１０を撮像装置６の各ターミナルに移動させて外観検測を行い、及び収集装置７に移動させて最後の材料収集作業を行う。なお、電子素子１０の回転盤３１に伴う移動の経路を、半径が回転盤３１の半径より小さい円形経路である材料の走行ライン（図６の回転盤３１上の破線に示すように）と定義する。 The transmission device 3 includes a turntable 31 and a motor 32. In one embodiment, the rotating disk 31 is an annular transparent disk made of glass, and the rotating disk 31 is disposed horizontally and is dynamically connected to a motor 32, whereby the rotating disk 31 is driven by the motor 32 to be horizontally driven. As a rotating platform for loading the electronic element 10, the electronic element 10 is moved to each terminal of the imaging device 6 by rotation to perform appearance inspection, and is moved to the collection device 7 to perform the last material collection work. The path of movement of the electronic element 10 along the turntable 31 is defined as a traveling line of a material having a circular path whose radius is smaller than the radius of the turntable 31 (as shown by a broken line on the turntable 31 in FIG. 6). I do.
供給装置４は、振動盤４１及びフィードトラック４２を含む。一実施例において、振動盤４１は円盤であり、環状振動により電子素子１０を盤の中心から円盤の螺旋経路に沿って移載させ、最外縁の経路まで順次に配列させてフィードトラック４２に進入させるように構成されている。フィードトラック４２は、振動盤４１に連接され、かつ直線凹型溝槽であり、電子素子１０を積載して電子素子１０を直線の配列を形成させ、及び電子素子１０を直線に前進させて回転盤３１上に落下するように転送することができる。フィードトラック４２の末端は、回転盤３１の表面に接近するまで延伸されるが接触せず、かつフィードトラック４２は、回転盤３１の回転方向の接線方向に沿って配置されることが好ましい。 The supply device 4 includes a vibration plate 41 and a feed track 42. In one embodiment, the vibrating disk 41 is a disk, and the electronic elements 10 are transferred along the spiral path of the disk from the center of the disk by annular vibration, and are sequentially arranged from the outermost edge path to enter the feed track 42. It is configured to be. The feed track 42 is connected to the vibrating plate 41 and is a linear concave groove tank. The electronic device 10 is loaded thereon to form a linear array of the electronic devices 10, and the electronic device 10 is advanced linearly to rotate the rotating plate. 31 can be transferred to fall. It is preferable that the end of the feed track 42 is extended until it comes close to the surface of the turntable 31 but does not touch it, and the feed track 42 is arranged along a tangential direction of the rotation direction of the turntable 31.
外観検測装置２は、回転盤３１を取り囲んで配置される複数の撮像装置６を含み、且つ各撮像装置６は、それぞれ異なる画像取込角度により異なる角度で回転盤３１に近づいて配置される。各撮像装置６は、撮影レンズ６１及び垂直スライドレール６２を含み、前記撮影レンズは、摺動可能に垂直スライドレール６２上に設けられ、かつ外観検測を行うために電子素子１０の各視点の映像を撮るように構成されている。撮像装置６は、必要に応じて反射鏡を更に含んでもよい。当該反射鏡は、撮影レンズ６１が電子素子１０の映像を撮るように、回転盤３１に対応して配置され、これによって、回転盤３１上の積載の電子素子１０を映し出す。反射鏡を設置することで、回転盤３１に設置される撮像装置６の数量を減少させることができる。 The appearance inspection device 2 includes a plurality of imaging devices 6 arranged so as to surround the turntable 31, and each of the image pickup devices 6 is arranged closer to the turntable 31 at a different angle depending on a different image capturing angle. . Each imaging device 6 includes a photographing lens 61 and a vertical slide rail 62, and the photographing lens is slidably provided on the vertical slide rail 62, and is provided at each viewpoint of the electronic element 10 to perform appearance inspection. It is configured to take video. The imaging device 6 may further include a reflecting mirror as needed. The reflecting mirror is arranged corresponding to the turntable 31 so that the photographing lens 61 takes an image of the electronic element 10, thereby projecting the mounted electronic element 10 on the turntable 31. By installing the reflecting mirror, the number of the imaging devices 6 installed on the turntable 31 can be reduced.
収集装置７は、複数の収集ボックス７１及び複数の収集ボックス７１に対応する複数のノズル７２を含み、各ノズル７２は、対応する収集ボックス７１に向かって配置され、かつ圧力を調整できる安定な正圧気源にそれぞれ連接する。各ノズル７２上には、電磁弁が設けられ、各電磁弁はコントローラーをそれぞれ電気的に連接されるため、コントローラーは、電磁弁により各ノズル７２の吹込みの時点をコントロールすることができ、これによって、各電子素子１０の検測結果に基づいて各電子素子１０をそれぞれ対応する収集ボックス７１の中に吹き込む。一実施例において、収集装置７は、四つの収集ボックス７１を含み、二つの収集ボックス７１は、不良であると検測された電子素子１０を収集し、不良程度の異なる電子素子１０を収集するように設定することができ（例えば、一つの収集ボックス７１は、外観に損傷のない電子素子１０を収集し、他の収集ボックス７１は、外観の鍍金の不均一な電子素子１０を収集し、このような鍍金の不均一な電子素子１０は、後続的に再び鍍金加工を行ってから再び検測した後に利用することができる）、一つの収集ボックス７１は、合格であると検測された電子素子１０を収集し、他の一つの収集ボックス７１は、再び検測する必要のある、例えば電子素子１０の画像撮りが成功的にできなかった電子素子１０を収集する。当然、収集ボックス７１の数量及び用途の配置は、異なる需要により調整することができ、前述の実施例に限らない。 The collecting device 7 includes a plurality of collecting boxes 71 and a plurality of nozzles 72 corresponding to the plurality of collecting boxes 71. Each nozzle 72 is arranged toward the corresponding collecting box 71 and has a stable positive pressure capable of adjusting the pressure. Each is connected to a pressure source. An electromagnetic valve is provided on each nozzle 72, and each electromagnetic valve is electrically connected to a controller. Therefore, the controller can control the time of blowing of each nozzle 72 by the electromagnetic valve. Then, each electronic element 10 is blown into the corresponding collection box 71 based on the inspection result of each electronic element 10. In one embodiment, the collection device 7 includes four collection boxes 71, and the two collection boxes 71 collect the electronic elements 10 detected as defective and collect the electronic elements 10 having different degrees of failure. (For example, one collection box 71 collects the electronic elements 10 having no damage in appearance, and the other collection box 71 collects the electronic elements 10 having uneven plating in appearance, Such a non-uniformly plated electronic device 10 can be used after subsequent plating and then re-measurement), and one collection box 71 was determined to be acceptable. The electronic device 10 is collected, and another collection box 71 collects the electronic device 10 that needs to be measured again, for example, the image of the electronic device 10 cannot be successfully captured. Naturally, the number of collection boxes 71 and the arrangement of applications can be adjusted according to different demands, and are not limited to the above-described embodiment.
電子素子１０の各視点の映像を有効に撮るために、撮像装置６の撮影レンズ６１の画像撮りが便利になるように、回転盤３１上の電子素子１０は一定の間隔を維持することが必要であるため、電子素子１０の同士の間隔を引き離すように、回転盤３１の回転速度が電子素子１０の電子素子落下速度より大きいことは必然である。したがって、電子素子１０が、回転速度がより速い回転盤３１に落下する場合、傾く現象の発生を避けにくく、後端の画像取込の品質に影響を与える。したがって、この欠損を改善するために、本発明の外観検測装置２は、有効な外観検測を行うために、電子素子落下の安定度を増加させるように構成されている電子素子安定装置５を含む。 In order to effectively take a picture of each viewpoint of the electronic element 10, it is necessary to maintain a constant interval between the electronic elements 10 on the turntable 31 so that it is convenient to take an image with the taking lens 61 of the imaging device 6. Therefore, it is inevitable that the rotation speed of the turntable 31 is higher than the electronic element falling speed of the electronic element 10 so as to increase the distance between the electronic elements 10. Therefore, when the electronic element 10 falls on the turntable 31 having a higher rotation speed, it is difficult to avoid the occurrence of a tilting phenomenon, which affects the quality of image capture at the rear end. Therefore, in order to improve this defect, the appearance inspection device 2 of the present invention uses an electronic element stabilization device 5 configured to increase the stability of dropping electronic elements in order to perform effective appearance inspection. including.
図５〜図８は、本発明の電子素子安定装置の設計を明確に解釈するために、外観検測装置の部分構造及び積載した電子素子を示す概略図である。図３〜図８を参照されたい。電子素子安定装置５は、フィードトラック４２の末端の出口（即ち、電子素子落下処）に設置され、かつ回転盤３１の材料の走行ライン（回転盤３１上の円形破線に示されるように）の外側に設置される。電子素子安定裝置５は、ガイドホイール５１と、モータ５２及び負圧発生器５３を含む。ガイドホイール５１は、略円盤状をなし、回転盤３１と同様に水平に配置され、かつモータ５２と動力的に連接され、これによって、モータ５２により駆動されて水平に回転する。ガイドホイール５１は、材料の走行ラインの外側に設置され、且つ滑らかな円弧面５１１を有する。一実施例において、円弧面５１１と材料の走行ラインは外接する。電子素子１０がガイドホイール５１の円弧面５１１に接触する場合、ガイドホイール５１の回転に伴って材料の走行ライン上に順次配列するように導かれる。 FIGS. 5 to 8 are schematic views showing a partial structure of an appearance inspection device and loaded electronic elements in order to clearly interpret the design of the electronic element stabilizer of the present invention. Please refer to FIGS. The electronic element stabilizer 5 is installed at the exit at the end of the feed track 42 (that is, at the electronic element dropping point), and on the running line of the material of the turntable 31 (as shown by the broken line on the turntable 31). Installed outside. The electronic device stabilizer 5 includes a guide wheel 51, a motor 52 and a negative pressure generator 53. The guide wheel 51 has a substantially disk shape, is arranged horizontally like the rotating disk 31, and is motively connected to the motor 52, whereby the guide wheel 51 is driven by the motor 52 to rotate horizontally. The guide wheel 51 is installed outside the running line of the material and has a smooth arc surface 511. In one embodiment, the arc surface 511 and the material travel line circumscribe. When the electronic element 10 comes into contact with the arcuate surface 511 of the guide wheel 51, the electronic element 10 is guided so as to be sequentially arranged on the traveling line of the material as the guide wheel 51 rotates.
一実施例において、ガイドホイール５１の円弧面５１１の接線速度と回転盤３１の電子素子１０を積載した位置の接触面の接線速度は同じであり、言い換えれば、ガイドホイール５１の回転線速度Ｖ２と電子素子１０の回転盤３１上での走行線速度Ｖ１は同一であるため、前後の材料の間隔を安定させることができる。また、ガイドホイール５１の回転方向と回転盤３１の回転方向は逆であり、例えば、電子素子１０を電子素子落下電子素子落下処から引き離して撮像装置６に向いて移動させるように、回転盤３１は反時計回りの方向に回転し、ガイドホイール５１は時計回りの方向に回転する。あるいは、フィードトラック４２の配置方向が変換する場合、回転盤３１も反時計回りの方向に変更させ、ガイドホイール５１を時計回りの方向に変更させることができる。 In one embodiment, the tangential velocity of the arc surface 511 of the guide wheel 51 is the same as the tangential velocity of the contact surface of the turntable 31 at the position where the electronic element 10 is mounted. In other words, the rotational linear velocity V2 of the guide wheel 51 is equal to the tangential velocity. Since the traveling linear velocity V1 of the electronic element 10 on the turntable 31 is the same, the distance between the front and rear materials can be stabilized. The rotation direction of the guide wheel 51 and the rotation direction of the turntable 31 are opposite to each other. For example, the electronic device 10 is moved away from the electronic device dropping device and toward the image pickup device 6 by moving the turntable 31. Rotates in the counterclockwise direction, and the guide wheel 51 rotates in the clockwise direction. Alternatively, when the arrangement direction of the feed track 42 changes, the turntable 31 can also be changed in the counterclockwise direction, and the guide wheel 51 can be changed in the clockwise direction.
一実施例において、電子素子１０がガイドホイール５１の円弧面５１１に当接してガイドホイール５１の底部に落下しないように、ガイドホイール５１の底部と回転盤３１の表面との間隙Ｈは、約電子素子１０の厚さの１／３乃至２／３である。 In one embodiment, the gap H between the bottom of the guide wheel 51 and the surface of the turntable 31 is approximately equal to the electron so that the electronic element 10 does not abut on the arc surface 511 of the guide wheel 51 and drop to the bottom of the guide wheel 51. It is １ ／ to ／ of the thickness of the element 10.
負圧発生器５３は、ガイドホイール５１の底部に配置されるが、ガイドホイール５１に伴って回転しない。一実施例において、負圧発生器５３は、フィードトラック４２末端の出口の一側に近づくように設置される。負圧発生器５３は、配管５３１を含み、配管５３１の配置方向は、材料の走行ラインの接線方向に略垂直し、且つ配管５３１は、電子素子落下処に近づく一端に開口５３２を備える。負圧発生器５３が配管５３１において、例えば、吸引方式で負圧を形成する場合、開口５３２を介して吸引力を生成し、フィードトラック４２から落下した電子素子１０がガイドホイール５１に吸引され、ガイドホイール５１の円弧面５１１及び回転盤３１之表面に付着され、ガイドホイール５１の回転に伴って前方に転送するようにする。ガイドホイール５１の円弧面５１１の接線速度と回転盤３１の電子素子１０を積載した位置の接触面の接線速度が同一であるため、電子素子１０はもはや負圧発生器の吸引力の吸引を受けずガイドホイールから脱離する場合、電子素子１０の前進速度と回転盤３１の電子素子１０を積載した位置の接触面の接線速度は同じであり、即ち、回転盤３１において材料の走行ラインに沿って安定的に前進することができるため、電子素子落下の安定度をさらに向上させることができる。 The negative pressure generator 53 is arranged at the bottom of the guide wheel 51, but does not rotate with the guide wheel 51. In one embodiment, the negative pressure generator 53 is located close to one side of the outlet at the end of the feed track 42. The negative pressure generator 53 includes a pipe 531, the arrangement direction of the pipe 531 is substantially perpendicular to the tangential direction of the traveling line of the material, and the pipe 531 has an opening 532 at one end near the electronic element dropping place. When the negative pressure generator 53 generates a negative pressure in the pipe 531, for example, by a suction method, a suction force is generated through the opening 532, and the electronic element 10 dropped from the feed track 42 is sucked by the guide wheel 51, It is attached to the arc surface 511 of the guide wheel 51 and the surface of the turntable 31 and is transferred forward with the rotation of the guide wheel 51. Since the tangential speed of the arc surface 511 of the guide wheel 51 is the same as the tangential speed of the contact surface of the turntable 31 at the position where the electronic element 10 is mounted, the electronic element 10 is no longer attracted by the suction force of the negative pressure generator. When the electronic device 10 is separated from the guide wheel, the forward speed of the electronic element 10 and the tangential velocity of the contact surface of the turntable 31 at the position where the electronic element 10 is loaded are the same, that is, along the running line of the material on the turntable 31. As a result, it is possible to further improve the stability of dropping the electronic element.
一実施例において、電子素子１０がガイドホイール５１から脱離する場合、電子素子１０の縦方向と材料の走行ラインの夾角θは０〜１５度の角度の範囲を維持する。 In one embodiment, when the electronic device 10 is detached from the guide wheel 51, the included angle θ between the vertical direction of the electronic device 10 and the traveling line of the material is maintained in the range of 0 to 15 degrees.
一実施例において、負圧発生器５３は真空管装置であってもよいが、これに限らない。 In one embodiment, negative pressure generator 53 may be, but is not limited to, a vacuum tube device.
一実施例において、ガイドホイール５１の円弧面５１１における負圧発生器５３の配管５３１の開口５３２に対応する箇所とフィードトラック４２の末端の出口との間の距離Ｗは略一つの材料の距離であり、すなわち、電子素子１０の長さと略同等であり、当該距離Ｗは、異なる電子素子１０の長さによっても調整することができる。 In one embodiment, the distance W between the arc surface 511 of the guide wheel 51 corresponding to the opening 532 of the pipe 531 of the negative pressure generator 53 and the outlet at the end of the feed track 42 is approximately one material distance. Yes, that is, approximately equal to the length of the electronic element 10, and the distance W can be adjusted by the length of a different electronic element 10.
一実施例において、電子素子安定装置５が電子素子落下の安定度を向上させたため、フィードトラック４２の末端に低振動ブロックを配置する必要がなくなった。 In one embodiment, the electronic element stabilizer 5 improves the stability of dropping the electronic element, so that there is no need to arrange a low vibration block at the end of the feed track 42.
一実施例において、外観検測装置２は、選択的にガイド装置８を含んでもよく、電子素子安定装置５の下流側に設置される。ガイド装置８は、回転盤３１の上方に設置され、かつ材料の走行ラインの内側に位置するガイドブロック８１を含む。ガイドブロック８１は、材料の走行ラインに向いた一側において滑らかな円弧面８１１を備え、電子素子１０の周縁がガイドブロック８１の円弧面８１１触れる場合、さらに電子素子１０を接線方向上に校正させることができる。そして、電子素子安定装置５は、電子素子落下の傾き問題をほぼ回避したため、電子素子１０がガイドホイール５１から脱離する場合、殆どは材料の走行ライン上に校正されているため、一実施例において、外観検測装置２は、ガイド装置８に設置する必要がない。 In one embodiment, the appearance inspection device 2 may optionally include a guide device 8 and is installed downstream of the electronic element stabilizer 5. The guide device 8 includes a guide block 81 that is installed above the turntable 31 and that is located inside the traveling line of the material. The guide block 81 has a smooth arc surface 811 on one side facing the running line of the material. When the peripheral edge of the electronic element 10 touches the arc surface 811 of the guide block 81, the electronic element 10 is further calibrated tangentially. be able to. Since the electronic element stabilizer 5 substantially avoids the inclination problem of the electronic element dropping, when the electronic element 10 is detached from the guide wheel 51, most of the electronic element stabilizing device 5 is calibrated on the running line of the material. In the above, the appearance inspection device 2 does not need to be installed on the guide device 8.
上記で記述されたように、本願の電子素子安定装置５の設計により、電子素子１０が供給装置４のフィードトラック４２の出口から回転盤３１の表面に落下す場合、電子素子１０は、まず負圧発生器５３の吸引力によりガイドホイール５１に吸引されてガイドホイール５１に付着され、かつガイドホイール５１の回転に伴って前方に転送される。ガイドホイール５１の線速度と電子素子１０の回転盤３１条の走行線速度は同じであり、電子素子は、もはや負圧発生器５３の吸引力の吸引を受けずガイドホイール５１から脱離する場合、回転盤上において材料の走行ラインに沿って安定的に前進することができる。したがって、本発明の電子素子安定裝置５は、電子素子落下の安定度をさらに向上させることができ、従来技術の電子素子落下が傾いて不安定な問題を克服し、後端の撮像装置６が画像を有効に取り込み、外観検測装置２の検測効率を向上させる。一方、電子素子落下の安定度が大幅に向上されるため、回転盤３１の回転速度も約５ｒｐｍ〜１２ｒｐｍ （望ましくは１０ｒｐｍ〜１２ｒｐｍ）に向上させることになり、外観検測装置２の効率を高める。例えば、一分に８０００個、ひいては１００００個以上の材料を検測することができ、外観検測装置２の工業応用価値を大幅に向上させた。そして、電子素子安定装置５の設計により、本発明の外観検測装置２は、静電提供装置を採用しなくても電子素子１０が静電吸着力により回転盤３１に吸着されるため、静電提供装置を備える従来の外観検測装置と比べると、本発明の外観検測装置２は、装置のコストをより低下させることができ、操作員の安全性を増加させることができ、及び静電提供装置の清潔問題を回避することができる。 As described above, when the electronic device 10 falls on the surface of the turntable 31 from the outlet of the feed track 42 of the supply device 4 due to the design of the electronic device stabilizer 5 of the present application, the electronic device 10 first becomes negative. The suction is applied to the guide wheel 51 by the suction force of the pressure generator 53 and adheres to the guide wheel 51, and is transferred forward with the rotation of the guide wheel 51. When the linear velocity of the guide wheel 51 and the traveling linear velocity of the rotary plate 31 of the electronic element 10 are the same, and the electronic element no longer receives the suction force of the negative pressure generator 53 and separates from the guide wheel 51 In addition, it is possible to stably advance along the traveling line of the material on the turntable. Therefore, the electronic device stabilizing device 5 of the present invention can further improve the stability of the electronic device dropping, and overcome the problem of tilting the electronic device of the related art, which is unstable, and the imaging device 6 at the rear end can be improved. Images are effectively captured, and the inspection efficiency of the appearance inspection device 2 is improved. On the other hand, since the stability of dropping the electronic element is greatly improved, the rotation speed of the turntable 31 is also increased to about 5 rpm to 12 rpm (preferably 10 rpm to 12 rpm), and the efficiency of the appearance inspection device 2 is increased. . For example, it is possible to measure 8,000 materials per minute, and more than 10,000 materials per minute, thereby greatly improving the industrial application value of the appearance inspection device 2. The design of the electronic element stabilizing device 5 allows the appearance inspection device 2 of the present invention to attract the electronic element 10 to the turntable 31 by the electrostatic attraction force without using the static electricity providing device. Compared with a conventional appearance inspection device provided with a power supply device, the appearance inspection device 2 of the present invention can further reduce the cost of the device, increase the safety of operators, and reduce static electricity. The problem of cleanliness of the power supply device can be avoided.
当業者であれば、本発明の範囲内で変更や修正を加えることができ、いずれも特許請求の範囲に含まれる。 Those skilled in the art can make changes and modifications within the scope of the present invention, all of which are included in the claims.
１０：電子素子
１１：供給装置
１２：フィードトラック
１３：低振動ブロック
１３１：固定ねじ
１４：ガラス円盤
１５：ガイドブロック
１６：収集装置
２：外観検測装置
２１：ベース
３：伝送裝置
３１：回転盤
３２：モータ
４：供給装置
４１：振動盤
４２：フィードトラック
５：電子素子安定裝置
５１：ガイドホイール
５１１：円弧面
５２：モータ
５３：負圧発生器
５３１：配管
５３２：開口
６：撮像装置
６１：撮影レンズ
６２：垂直スライドレール
７：収集装置
７１：収集ボックス
７２：ノズル
８：ガイド装置
８１：ガイドブロック
８１１：円弧面
Ｖ１：電子素子の回転盤上の走行線速度
Ｖ２：ガイドホイールの回転線速度
Ｈ：ガイドホイールの底部と回転盤の表面との間隙
θ：電子素子と材料の走行ラインとの夾角
Ｗ：負圧発生器の配管開口とフィードトラックの末端の出口との間隔
10: Electronic element 11: Supply device 12: Feed track 13: Low vibration block 131: Fixing screw 14: Glass disk 15: Guide block 16: Collection device 2: Appearance inspection device 21: Base 3: Transmission device 31: Turntable 32: motor 4: supply device 41: vibrating plate 42: feed track 5: electronic element stabilization device 51: guide wheel 511: arc surface 52: motor 53: negative pressure generator 531: pipe 532: opening 6: imaging device 61: Photographing lens 62: Vertical slide rail 7: Collection device 71: Collection box 72: Nozzle 8: Guide device 81: Guide block 811: Arc surface V1: Running linear velocity of the electronic element on the turntable V2: Rotation linear velocity of the guide wheel H: The gap between the bottom of the guide wheel and the surface of the turntable θ: The included angle between the electronic element and the traveling line of the material W: Piping of the negative pressure generator Distance between outlet end mouth and a feed track
Claims (13)
前記外観検測装置は、フィードトラックと、回転盤と、を含み、
前記回転盤は、前記フィードトラックから落下する複数の電子素子を積載し、前記複数の電子素子を材料の走行ラインに沿って移動させ、
前記電子素子安定装置は、ガイドホイールと、モータと、負圧発生器と、を含み、
前記ガイドホイールは、前記材料の走行ラインの外側に設置され、かつ円弧面を有し、
前記モータは、前記ガイドホイールの回転を駆動するように前記ガイドホイールと連接され、
前記負圧発生器は、前記ガイドホイールの底部に設置され、かつ、フィードトラックから落下する各前記電子素子が前記ガイドホイールに吸われ、前記ガイドホイールの前記円弧面に付着され、前記ガイドホイールの回転に伴って前に転送されるように、吸引力を発生させ、
前記ガイドホイールの線速度と前記電子素子の前記回転盤での走行線速度は同じであり、前記電子素子がもはや負圧発生器の吸引力での吸引を受けず前記ガイドホイールから脱離する場合、前記電子素子が前記回転盤において前記材料の走行ラインに沿って安定的に前進する、ことを特徴とする電子素子安定装置。 An electronic element stabilizer applied to an appearance inspection device,
The appearance inspection device includes a feed track and a turntable,
The turntable is loaded with a plurality of electronic elements that fall from the feed track, and moves the plurality of electronic elements along a traveling line of the material,
The electronic element stabilizer includes a guide wheel, a motor, and a negative pressure generator,
The guide wheel is installed outside a traveling line of the material, and has an arc surface,
The motor is connected to the guide wheel to drive rotation of the guide wheel,
The negative pressure generator is installed at the bottom of the guide wheel, and each of the electronic elements falling from the feed track is sucked by the guide wheel, attached to the arc surface of the guide wheel, and Generate suction force so that it is forwarded with rotation,
When the linear velocity of the guide wheel is the same as the linear velocity of travel of the electronic element on the turntable, and the electronic element is no longer sucked by the suction force of the negative pressure generator and detaches from the guide wheel. An electronic element stabilizing device, wherein the electronic element stably advances along a traveling line of the material on the rotating disk.
ことを特徴とする請求項１に記載の電子素子安定装置。 Installed at the exit at the end of the feed truck,
The electronic device stabilizer according to claim 1, wherein:
ことを特徴とする請求項１に記載の電子素子安定装置。 The arc surface of the guide wheel and the traveling line of the material are circumscribed,
The electronic device stabilizer according to claim 1, wherein:
ことを特徴とする請求項１に記載の電子素子安定装置。 The rotation direction of the guide wheel and the rotation direction of the turntable are opposite,
The electronic device stabilizer according to claim 1, wherein:
ことを特徴とする請求項１に記載の電子素子安定装置。 The negative pressure generator includes a pipe whose arrangement direction is substantially perpendicular to a tangential direction of the material.
The electronic device stabilizer according to claim 1, wherein:
ことを特徴とする請求項６に記載の電子素子安定装置。 The pipe has an opening at one end close to where the electronic element falls,
The electronic device stabilizer according to claim 6, wherein:
ことを特徴とする請求項７に記載の電子素子安定装置。 The distance between the point corresponding to the opening of the pipe on the arc surface of the guide wheel and the outlet at the end of the feed track is substantially equal to the length of the electronic element;
The electronic device stabilizer according to claim 7, wherein
ことを特徴とする請求項１に記載の電子素子安定装置。 When the electronic element is detached from the guide wheel, an included angle between the longitudinal direction of the electronic element and the traveling line is about 0 to 15 degrees,
The electronic device stabilizer according to claim 1, wherein:
ことを特徴とする請求項１に記載の電子素子安定装置。 The negative pressure generator is a vacuum tube device;
The electronic device stabilizer according to claim 1, wherein:
前記供給装置は、フィードトラックを備え、かつ複数の電子素子を転送するように構成され供給装置、
前記回転盤は、フィードトラックから落下する前記複数の電子素子を積載し、かつ複数の電子素子を材料の走行ラインに沿って移動させるように構成され、
前記電子素子安定装置は、ガイドホイールと、モータと、負圧発生器と、を含み、
前記ガイドホイールは、前記材料の走行ラインの外側に設置され、かつ円弧面を有し、
前記モータは、前記ガイドホイールの回転を駆動するように、前記ガイドホイールと連接され、
前記負圧発生器は、前記ガイドホイールの底部に設置され、かつ前記フィードトラックから落下する各前記電子素子が前記ガイドホイールに吸われて前記ガイドホイールの前記円弧面に付着され、前記ガイドホイールの回転に伴って前に向けて転送されるように、吸引力を発生させ、
前記ガイドホイールの線速度と前記電子素子の前記回転盤での走行線速度は同じであり、前記電子素子がもはや負圧発生器の吸引力の吸引を受けず前記ガイドホイールから脱離する場合、前記電子素子が前記回転盤上において材料の走行ラインに沿って安定的に前進し、
前記撮像装置は、外観検測を行うために電子素子の各視点の映像を撮るように構成され、
前記収集装置は、外観検測の結果に基づいて電子素子を収集するように構成される、
ことを特徴とする外観検測装置。 An appearance inspection device, wherein the appearance inspection device includes a supply device, a turntable, an electronic element stabilizer, a plurality of imaging devices, and a collection device,
The supply device includes a feed track, and is configured to transfer a plurality of electronic elements, a supply device,
The turntable is configured to load the plurality of electronic elements falling from a feed track, and to move the plurality of electronic elements along a traveling line of the material,
The electronic element stabilizer includes a guide wheel, a motor, and a negative pressure generator,
The guide wheel is installed outside a traveling line of the material, and has an arc surface,
The motor is connected to the guide wheel to drive rotation of the guide wheel,
The negative pressure generator is installed at the bottom of the guide wheel, and each of the electronic elements falling from the feed track is sucked by the guide wheel and attached to the arc surface of the guide wheel. Generate suction force so that it is transferred forward with rotation,
When the linear velocity of the guide wheel and the traveling linear velocity of the electronic element on the turntable are the same, and the electronic element no longer receives the suction force of the negative pressure generator and separates from the guide wheel, The electronic element is stably advanced along the traveling line of the material on the turntable,
The imaging device is configured to take an image of each viewpoint of the electronic element to perform appearance inspection,
The collection device is configured to collect an electronic element based on a result of the appearance inspection,
An appearance inspection device characterized by the above-mentioned.
ことを特徴とする請求項１１に記載の外観検測装置。 Further comprising a guide device installed downstream of the electronic element stabilizer,
The appearance inspection device according to claim 11, wherein:
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| TW202012285A (en) | 2020-04-01 |
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