TW201947694A - Micro LED adsorption body - Google Patents

Micro LED adsorption body Download PDF

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Publication number
TW201947694A
TW201947694A TW108114643A TW108114643A TW201947694A TW 201947694 A TW201947694 A TW 201947694A TW 108114643 A TW108114643 A TW 108114643A TW 108114643 A TW108114643 A TW 108114643A TW 201947694 A TW201947694 A TW 201947694A
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micro led
mask
porous member
micro
vacuum
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TW108114643A
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安範模
朴勝浩
徐東奕
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南韓商普因特工程有限公司
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67144Apparatus for mounting on conductive members, e.g. leadframes or conductors on insulating substrates
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67703Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
    • H01L21/67712Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations the substrate being handled substantially vertically
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67703Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
    • H01L21/67721Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations the substrates to be conveyed not being semiconductor wafers or large planar substrates, e.g. chips, lead frames
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/6838Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping with gripping and holding devices using a vacuum; Bernoulli devices
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L25/00Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
    • H01L25/03Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
    • H01L25/04Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
    • H01L25/075Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L33/00
    • H01L25/0753Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L33/00 the devices being arranged next to each other
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/005Processes
    • H01L33/0095Post-treatment of devices, e.g. annealing, recrystallisation or short-circuit elimination
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/48Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2933/00Details relating to devices covered by the group H01L33/00 but not provided for in its subgroups
    • H01L2933/0008Processes
    • H01L2933/0033Processes relating to semiconductor body packages

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  • Engineering & Computer Science (AREA)
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  • Physics & Mathematics (AREA)
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  • Led Device Packages (AREA)
  • Led Devices (AREA)

Abstract

The present invention relates to a micro LED adsorption body for vacuum-sucking micro LEDs. More particularly, the present invention relates to a micro LED adsorption body provided with a mask below a porous member to increase vacuum pressure for vacuum-sucking micro LEDs such that the micro LEDs are transferred without deviation.

Description

微LED吸附體Micro LED adsorbent

本發明關於一種吸附微發光二極體(Light Emitting Diode,LED)的吸附體。The invention relates to an adsorbent that adsorbs a light emitting diode (LED).

目前,顯示器市場仍以液晶顯示裝置(Liquid Crystal Display,LCD)為主流,但有機發光二極體(Organic Light Emitting Diode,OLED)正快速地替代LCD而逐漸成為主流。最近,在顯示器企業參與OLED市場成為熱潮的情況下,微(Micro)LED(以下,稱為「微LED」)顯示器也逐漸成為下一代顯示器。LCD與OLED的核心原材料分別為液晶(Liquid Crystal)、有機材料,與此相反,微LED顯示器是將1微米至100微米(μm)單位的LED晶片本身用作發光材料的顯示器。Currently, the liquid crystal display (LCD) device is still the mainstream in the display market, but Organic Light Emitting Diode (OLED) is rapidly replacing LCD and gradually becoming the mainstream. Recently, when display companies' participation in the OLED market has become a boom, Micro LED (hereinafter referred to as "micro LED") displays have gradually become the next-generation displays. The core raw materials of LCD and OLED are liquid crystal and organic materials. In contrast, micro LED displays are displays that use LED chips in units of 1 to 100 micrometers (μm) as the light-emitting materials.

隨著科銳(Cree)公司在1999年申請有關「提高光輸出的微-發光二極體陣列」的專利(註冊專利公報註冊編號第0731673號)而出現微LED一詞以來,陸續發表相關研究論文,並且進行研究開發。作為為了將微LED應用在顯示器而需解決的問題,需開發一種基於撓性(Flexible)原材料/元件製造微LED元件的定製型微晶片,需要一種微米尺寸的LED晶片的轉移(transfer)技術與準確地安裝(Mounting)到顯示器像素電極的技術。As Cree applied for a patent on "Micro-Light Emitting Diode Arrays for Increasing Light Output" in 1999 (Registered Patent Gazette Registration No. 0731673) and the term micro LED appeared, related studies have been published successively Thesis, and research and development. As a problem to be solved in order to apply micro LEDs to displays, it is necessary to develop a custom microchip based on flexible raw materials / components for manufacturing micro LED components, and a micron-sized LED chip transfer technology is required. With the technology of accurately mounting (Mounting) the pixel electrode of the display.

尤其,關於將微LED元件傳送到顯示基板的轉移(transfer),因LED尺寸變小至1微米至100微米(μm)單位而無法使用以往的取放(pick & place)設備,需要一種以更高精確度進行傳送的轉移頭技術。關於這種轉移頭技術,揭示如下所述的幾種構造,但所揭示的各技術具有幾個缺點。In particular, regarding transfer of transferring micro LED elements to a display substrate, conventional LED pick and place equipment cannot be used because the size of LEDs has been reduced to units of 1 to 100 micrometers (μm). High-precision transfer head technology. Regarding this transfer head technology, several configurations described below are disclosed, but each technology disclosed has several disadvantages.

美國的勒克思維(Luxvue)公司揭示了一種利用靜電頭(electrostatic head)轉移微LED的方法(公開專利公報公開編號第2014-0112486號,以下稱為「現有發明1」)。現有發明1的轉移原理為對由矽材質製成的頭部分施加電壓,由此,因靜電現象與微LED產生密接力。所述方法在靜電感應時會因施加在頭部的電壓產生因靜電現象引起的微LED損傷的問題。The Luxvue company in the United States has disclosed a method for transferring micro LEDs using an electrostatic head (Publication Gazette Publication No. 2014-0112486, hereinafter referred to as "Existing Invention 1"). The transfer principle of the existing invention 1 is to apply a voltage to a head portion made of a silicon material, thereby generating a close contact with the micro LED due to an electrostatic phenomenon. In the method, when the electrostatic induction is performed, the micro LED damage caused by the electrostatic phenomenon is caused by the voltage applied to the head.

美國的X-Celeprint公司揭示了一種應用具有彈性的聚合物物質作為轉移頭而將晶片上的微LED傳送到所期望的基板的方法(公開專利公報公開編號第2017-0019415號,以下稱為「現有發明2」)。與靜電頭方式相比,所述方法無LED損傷的問題,但存在如下缺點:在轉移過程中,只有彈性轉移頭的接著力大於目標基板的接著力才可穩定地傳送微LED,需另外進行用以形成電極的製程。另外,持續地保持彈性聚合物物質的接著力也為非常重要的要素。X-Celeprint Corporation in the United States has disclosed a method for transferring a micro LED on a wafer to a desired substrate by using a polymer material having elasticity as a transfer head (Publication Publication No. 2017-0019415, hereinafter referred to as " Existing Invention 2 "). Compared with the electrostatic head method, the method does not have the problem of LED damage, but has the following disadvantages: during the transfer process, only the adhesive force of the elastic transfer head is greater than the adhesive force of the target substrate can the micro LED be stably transferred, which needs to be performed separately. The process used to form the electrode. In addition, it is also very important to maintain the adhesion of the elastic polymer substance continuously.

韓國光技術院揭示了一種利用纖毛接著構造頭轉移微LED的方法(註冊專利公報註冊編號第1754528號,以下稱為「現有發明3」)。然而,現有發明3存在難以製作纖毛的接著構造的缺點。The Korea Institute of Optical Technology has disclosed a method for transferring micro LEDs by using cilia and then constructing a head (registered patent publication registration number 1754528, hereinafter referred to as "existing invention 3"). However, the conventional invention 3 has a disadvantage that it is difficult to produce a bonding structure of cilia.

韓國機械研究院揭示了一種在輥上塗覆接著劑來轉移微LED的方法(註冊專利公報註冊編號第1757404號,以下稱為「現有發明4」)。然而,現有發明4存在如下缺點:需持續使用接著劑,在對輥進行加壓時,微LED也會受損。The Korea Institute of Machinery has disclosed a method for transferring micro LEDs by applying an adhesive on a roller (registered patent publication registration number 1757404, hereinafter referred to as "existing invention 4"). However, the conventional invention 4 has the following disadvantages: the adhesive needs to be continuously used, and the micro LED is also damaged when the roller is pressurized.

三星顯示器揭示了一種在陣列基板浸入在溶液的狀態下對陣列基板的第一電極、第二電極施加負電壓而藉由靜電感應現象將微LED轉移到陣列基板的方法(公開專利公報第10-2017-0026959號,以下稱為「現有發明5」)。然而,現有發明5存在如下缺點:在將微LED浸入到溶液而轉移到陣列基板的方面而言,需要另外的溶液,此後需要乾燥製程。Samsung Display has disclosed a method for transferring a micro LED to an array substrate through electrostatic induction by applying a negative voltage to the first and second electrodes of the array substrate while the array substrate is immersed in a solution (Publication Patent Publication No. 10-2017 -0026959, hereinafter referred to as "Existing Invention 5"). However, the conventional invention 5 has the following disadvantages: in terms of immersing the micro LED in a solution and transferring it to the array substrate, an additional solution is required, and thereafter a drying process is required.

LG電子揭示了一種將頭保持器配置到多個拾取頭與基板之間,隨多個拾取頭的移動而形狀變形來對多個拾取頭提供自由度的方法(公開專利公報第10-2017-0024906號,以下稱為「現有發明6」)。然而,現有發明6具有如下缺點:其為在多個拾取頭的接著面塗布具有接著力的接合物質而轉移微LED的方式,因此需要在拾取頭塗布接合物質的另外的製程。LG Electronics has disclosed a method of arranging a head holder between a plurality of pickup heads and a substrate and deforming the shape as the plurality of pickup heads move to provide freedom to the plurality of pickup heads (Publication Publication No. 10-2017- No. 0024906, hereinafter referred to as "Existing Invention 6"). However, the conventional invention 6 has a disadvantage in that it is a method for transferring micro LEDs by applying a bonding substance having a bonding force to the bonding surfaces of a plurality of pick-up heads, and therefore requires a separate process for coating the pick-up head with a bonding substance.

為了解決如上所述的現有發明的問題,需在直接使用現有發明所採用的基本原理的同時改善上述缺點,但如上所述的缺點是從現有發明所使用的基本原理衍生,因此在保持基本原理的同時改善缺點的方面存在極限。因此,本發明的申請人不僅改善這些以往技術的缺點,而且揭示一種在現有發明中完全未考慮過的新穎的方式。In order to solve the problems of the existing inventions described above, the above-mentioned disadvantages need to be improved while directly using the basic principles adopted by the existing inventions, but the disadvantages described above are derived from the basic principles used in the existing inventions, so the basic principles are maintained There are limits to the aspects that can improve the disadvantages at the same time. Therefore, the applicant of the present invention not only improves these shortcomings of the prior art, but also reveals a novel way that has not been considered in the existing invention.

[[ 現有技術文獻Prior art literature ]]

[ 專利文獻 ]
(專利文獻1)註冊專利公報註冊編號第0731673號
(專利文獻2)公開專利公報公開編號第2014-0112486號
(專利文獻3)公開專利公報公開編號第2017-0019415號
(專利文獻4)註冊專利公報註冊編號第1754528號
(專利文獻5)註冊專利公報註冊編號第1757404號
(專利文獻6)公開專利公報第10-2017-0026959號
(專利文獻7)公開專利公報第10-2017-0024906號
[ Patent Literature ]
(Patent Document 1) Registered Patent Gazette Registration No. 0731673 (Patent Document 2) Published Patent Gazette Publication No. 2014-0112486 (Patent Document 3) Published Patent Gazette Publication No. 2017-0019415 (Patent Document 4) Registered Patent Gazette Registration Number 1754528 (Patent Document 5) Registered Patent Gazette Registration Number 1757404 (Patent Document 6) Published Patent Gazette 10-2017-0026959 (Patent Document 7) Published Patent Gazette 10-2017-0024906

[[ 發明要解決的問題Problems to be solved by invention ]]

因此,本發明的目的在於解決迄今為止所揭示的微LED吸附體的問題而提供一種在多孔性部件的下部配備遮罩,由此形成較大的真空壓而在真空吸附微LED時吸附力變高,可不使微LED脫落而進行傳送的微LED吸附體。Therefore, an object of the present invention is to solve the problem of the micro LED adsorbent disclosed so far and provide a mask provided on the lower part of the porous member, thereby forming a large vacuum pressure and changing the adsorption force when the micro LED is vacuum adsorbed. It is a micro LED absorber that is high and can be transferred without dropping the micro LED.

[[ 解決問題的手段Problem solving ]]

根據本發明的一特徵的微LED吸附體的特徵在於配備:多孔性部件,具有氣孔;以及遮罩,配備到所述多孔性部件的下部,具有開口部。A micro LED adsorbent according to a feature of the present invention is provided with a porous member having air holes, and a mask provided to a lower portion of the porous member and having an opening portion.

另外,所述微LED吸附體的特徵在於:所述遮罩為鎳鋼材質。In addition, the micro LED adsorbent is characterized in that the mask is made of nickel steel.

另外,所述微LED吸附體的特徵在於:所述遮罩為金屬材質。In addition, the micro LED adsorbent is characterized in that the mask is made of a metal material.

另外,所述微LED吸附體的特徵在於:所述遮罩為膜材質。In addition, the micro LED adsorbent is characterized in that the mask is made of a film material.

另外,所述微LED吸附體的特徵在於:所述遮罩為紙材質。In addition, the micro LED adsorbent is characterized in that the mask is made of paper.

另外,所述微LED吸附體的特徵在於:所述遮罩藉由所述多孔性部件的真空吸入力吸附到所述多孔性部件而配備。In addition, the micro LED adsorbent is characterized in that the mask is provided by being adsorbed to the porous member by a vacuum suction force of the porous member.

[[ 發明效果Invention effect ]]

如上所述,本發明的微LED吸附體配備遮罩而可通過遮罩的開口部更大地形成真空吸附微LED的真空壓,因此在微LED真空吸附到具有均勻的平坦度的多孔性部件的下部表面時,可更充分地執行真空吸附功能,由此可防止在進行真空吸附時發生脫落。As described above, the microLED adsorbent of the present invention is equipped with a mask, and the vacuum pressure of the vacuum-adsorbed microLED can be formed more through the opening of the mask. Therefore, the microLED is vacuum-adsorbed to a porous member having a uniform flatness. In the lower surface, the vacuum suction function can be performed more fully, which can prevent falling off during vacuum suction.

以下內容僅例示發明的原理。因此,雖未在本說明書中明確地進行說明或圖示,但本領域技術人員可實現發明的原理而發明包括在發明的概念與範圍內的各種裝置。另外,應理解,本說明書中所列舉的所有附有條件的術語及實施例在原則上僅明確地用於理解發明的概念,並不限制於像這樣特別列舉的實施例及狀態。The following merely illustrates the principles of the invention. Therefore, although not explicitly described or illustrated in this specification, those skilled in the art can implement the principles of the invention and invent various devices included in the concept and scope of the invention. In addition, it should be understood that all the conditional terms and examples listed in the present specification are only used to understand the concept of the invention explicitly in principle, and are not limited to the examples and states specifically listed as such.

上述目的、特徵及優點根據與附圖相關的以下的詳細說明而變得更明確,因此發明所屬的技術領域內的普通技術人員可容易地實施發明的技術思想。The above-mentioned objects, features, and advantages will become clearer from the following detailed description in relation to the accompanying drawings. Therefore, those skilled in the art to which the invention pertains can easily implement the technical idea of the invention.

參考作為本發明的理想的例示圖的剖面圖及/或立體圖,對本說明書中所記述的實施例進行說明。為了有效地說明技術內容,誇張地繪示這些附圖中所示的膜及區域的厚度及孔的直徑等。例示圖的形態會因製造技術及/或容許誤差等而變形。另外,附圖中所示的微LED的個數僅例示性地在附圖中繪示一部分。因此,本發明的實施例也包括根據製造製程發生的形態的變化,並不限制於所圖示的特定形態。The embodiments described in this specification will be described with reference to a cross-sectional view and / or a perspective view which are ideal illustrations of the present invention. In order to effectively explain the technical contents, the thicknesses of the films and regions shown in these drawings, the diameter of the holes, and the like are exaggeratedly illustrated. The form of the illustration is deformed by manufacturing techniques and / or tolerances. In addition, the number of micro LEDs shown in the drawings is only a part of the drawings. Therefore, the embodiments of the present invention also include changes in the forms that occur according to the manufacturing process, and are not limited to the specific forms shown.

在對各種實施例進行說明時,即便實施例不同,方便起見而也對執行相同的功能的構成要素賦予相同的名稱及相同的參照符號。另外,方便起見,省略已在其他實施例中說明的構成及動作。When describing various embodiments, even if the embodiments are different, for the sake of convenience, the constituent elements that perform the same functions are given the same names and the same reference signs. In addition, for convenience, the configurations and operations described in the other embodiments are omitted.

以下,參照附圖,詳細地對本發明的較佳實施例進行說明。Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the accompanying drawings.

圖1是繪示成為本發明的較佳實施例的微LED吸附體的傳送物件的多個微LED100的圖。微LED100製作定位在生長基板101上。FIG. 1 is a diagram illustrating a plurality of micro LEDs 100 that are a transfer object of a micro LED adsorbent according to a preferred embodiment of the present invention. The micro LED 100 is fabricated and positioned on the growth substrate 101.

生長基板101可包括導電性基板或絕緣性基板。例如,生長基板101可由藍寶石、SiC、Si、GaAs、GaN、ZnO、Si、GaP、InP、Ge、及Ga2 O3 中的至少任一種形成。The growth substrate 101 may include a conductive substrate or an insulating substrate. For example, the growth substrate 101 may be formed of at least any one of sapphire, SiC, Si, GaAs, GaN, ZnO, Si, GaP, InP, Ge, and Ga 2 O 3 .

微LED100可包括第一半導體層102、第二半導體層104、形成在第一半導體層102與第二半導體層104之間的活性層103、第一接觸電極106及第二接觸電極107。The micro LED 100 may include a first semiconductor layer 102, a second semiconductor layer 104, an active layer 103 formed between the first semiconductor layer 102 and the second semiconductor layer 104, a first contact electrode 106, and a second contact electrode 107.

第一半導體層102、活性層103及第二半導體層104可利用有機金屬化學沉積法(MOCVD,Metal Organic Chemical Vapor Deposition)、化學沉積法(CVD,Chemical Vapor Deposition)、等離子體化學沉積法(PECVD,Plasma-Enhanced Chemical Vapor Deposition)、分子束磊晶法(MBE,Molecular Beam Epitaxy)、氫化物氣相沉積法(HVPE,Hydride Vapor Phase Epitaxy)等方法形成。The first semiconductor layer 102, the active layer 103, and the second semiconductor layer 104 may use a metal organic chemical deposition method (MOCVD), a chemical deposition method (CVD), or a plasma chemical deposition method (PECVD). , Plasma-Enhanced Chemical Vapor Deposition), Molecular Beam Epitaxy (MBE, Molecular Beam Epitaxy), HVPE (Hydride Vapor Phase Epitaxy) and other methods.

第一半導體層102例如可由p型半導體層實現。p型半導體層可選自具有Inx Aly Ga1 x y N(0≤x≤1,0≤y≤1,0≤x+y≤1)的組成式的半導體材料、例如GaN、AlN、AlGaN、InGaN、InN、InAlGaN、AlInN等,可摻雜Mg、Zn、Ca、Sr、Ba等p型摻雜物。The first semiconductor layer 102 may be implemented by, for example, a p-type semiconductor layer. selected from p-type semiconductor layer has In x Al y Ga 1 - x - y N (0≤x≤1,0≤y≤1,0≤x + y≤1) semiconductor material composition formula, for example, GaN, AlN, AlGaN, InGaN, InN, InAlGaN, AlInN, etc. can be doped with p-type dopants such as Mg, Zn, Ca, Sr, and Ba.

第二半導體層104例如可包括n型半導體層而形成。n型半導體層可選自具有Inx Aly Ga1 x y N(0≤x≤1,0≤y≤1,0≤x+y≤1)的組成式的半導體材料、例如GaN、AlN、AlGaN、InGaN、InN、InAlGaN、AlInN等,可摻雜Si、Ge、Sn等n型摻雜物。The second semiconductor layer 104 may be formed including, for example, an n-type semiconductor layer. The n-type semiconductor layer may be selected from a semiconductor material having a composition formula of In x Al y Ga 1 - x - y N (0≤x≤1, 0≤y≤1, 0≤x + y≤1), such as GaN, AlN, AlGaN, InGaN, InN, InAlGaN, AlInN, etc. can be doped with n-type dopants such as Si, Ge, Sn.

然而,本發明並不限制於此,也可為第一半導體層102包括n型半導體層,第二半導體層104包括p型半導體層。However, the present invention is not limited thereto, and the first semiconductor layer 102 may include an n-type semiconductor layer, and the second semiconductor layer 104 may include a p-type semiconductor layer.

活性層103作為電子與電洞再結合的區域,因電子與電洞再結合而會轉變成低能階,產生具有與其對應的波長的光。活性層103例如可包括具有Inx Aly Ga1 x y N(0≤x≤1,0≤y≤1,0≤x+y≤1)的組成式的半導體材料而形成,可由單量子阱結構或多量子阱結構(Multi Quantum Well,MQW)形成。另外,也可包括量子線(Quantum wire)結構或量子點(Quantum dot)結構。The active layer 103 is a region where electrons and holes are recombined, and the electrons and holes are recombined to transform into a low energy level, thereby generating light having a wavelength corresponding thereto. The active layer 103 may include, for example, a semiconductor material having a composition formula of In x Al y Ga 1 - x - y N (0≤x≤1, 0≤y≤1, 0≤x + y≤1), and may be formed of a single quantum well Structure or Multi Quantum Well (MQW). In addition, a quantum wire structure or a quantum dot structure may be included.

可在第一半導體層102形成第一接觸電極106,在第二半導體層104形成第二接觸電極107。第一接觸電極106及/或第二接觸電極107可包括一個以上的層,可由包括金屬、導電性氧化物及導電性聚合物在內的各種導電性材料形成。A first contact electrode 106 may be formed on the first semiconductor layer 102 and a second contact electrode 107 may be formed on the second semiconductor layer 104. The first contact electrode 106 and / or the second contact electrode 107 may include one or more layers, and may be formed of various conductive materials including metals, conductive oxides, and conductive polymers.

可利用雷射等沿切割線切割形成在生長基板101上的多個微LED100或藉由蝕刻製程分離成單個,藉由雷射剝離製程使多個微LED100成為可從生長基板101分離的狀態。A plurality of micro LEDs 100 formed on the growth substrate 101 can be cut along a cutting line using a laser or the like, or separated into a single by an etching process, and a plurality of micro LEDs 100 can be separated from the growth substrate 101 by a laser peeling process.

在圖1中,「P」是指微LED100間的間距,「S」是指微LED100間的相隔距離,「W」是指微LED100的寬度。In FIG. 1, “P” refers to the distance between the micro LEDs 100, “S” refers to the separation distance between the micro LEDs 100, and “W” refers to the width of the micro LEDs 100.

圖2是繪示藉由根據本發明的較佳實施例的微LED吸附體傳送到顯示基板而安裝來形成的微LED構造體的圖。FIG. 2 is a diagram illustrating a microLED structure formed by transferring a microLED adsorbent according to a preferred embodiment of the present invention to a display substrate for installation.

顯示基板301可包括各種原材料。例如,顯示基板301可包括以SiO2 為主成分的透明的玻璃材質。然而,顯示基板301並非必須限定於此,可由透明的塑膠材質形成而具有可用性。塑膠材質可為選自由作為絕緣性有機物的聚醚碸(PES,polyethersulphone)、聚丙烯酸酯(PAR,polyacrylate)、聚醚醯亞胺(PEI,polyetherimide)、聚萘二甲酸乙二酯(PEN,polyethylene naphthalate)、聚對苯二甲酸乙二酯(PET,polyethylene terephthalate)、聚苯硫醚(polyphenylene sulfide,PPS)、聚芳酯(polyarylate)、聚醯亞胺(polyimide)、聚碳酸酯(PC)、三乙酸纖維素(TAC)、乙酸丙酸纖維素(cellulose acetate propionate,CAP)所組成的族群中的有機物。The display substrate 301 may include various raw materials. For example, the display substrate 301 may include a transparent glass material mainly composed of SiO 2 . However, the display substrate 301 is not necessarily limited to this, and may be formed of a transparent plastic material to have usability. The plastic material may be selected from the group consisting of polyethersulphone (PES), polyacrylate (PAR), polyetherimide (PEI, polyetherimide), and polyethylene naphthalate (PEN, polyethylene naphthalate), polyethylene terephthalate (PET), polyphenylene sulfide (PPS), polyarylate, polyimide, and polycarbonate (PC ), Organic triacetate (TAC), cellulose acetate propionate (CAP).

在為圖像朝顯示基板301方向實現的背面發光型的情況下,顯示基板301需由透明的材質形成。然而,在為圖像朝顯示基板301的相反方向實現的正面發光型的情況下,顯示基板301並非必須由透明的材質形成。在此情況下,可由金屬形成顯示基板301。In the case of a back-emitting type in which an image is directed toward the display substrate 301, the display substrate 301 needs to be formed of a transparent material. However, in the case of a front-emission type in which an image is realized in a direction opposite to the display substrate 301, the display substrate 301 does not have to be formed of a transparent material. In this case, the display substrate 301 may be formed of a metal.

在由金屬形成顯示基板301的情況下,顯示基板301可包括選自由鐵、鉻、錳、鎳、鈦、鉬、不銹鋼(SUS)、鎳鋼(Invar)合金、英高鎳(Inconel)合金及科伐(Kovar)合金所組成的族群中的一種以上,但並不限定於此。In the case where the display substrate 301 is formed of a metal, the display substrate 301 may include a material selected from the group consisting of iron, chromium, manganese, nickel, titanium, molybdenum, stainless steel (SUS), nickel steel (Invar) alloy, Inconel alloy, and One or more ethnic groups made up of Kovar alloys are not limited thereto.

顯示基板301可包括緩衝層311。緩衝層311可提供平坦面,可阻斷異物或濕氣滲透。例如,緩衝層311可含有氧化矽、氮化矽、氮氧化矽、氧化鋁、氮化鋁、氧化鈦或氮化鈦等無機物、或聚醯亞胺、聚酯、丙烯酸等有機物,可由例示的材料中的多種材料所構成的積層體形成。The display substrate 301 may include a buffer layer 311. The buffer layer 311 can provide a flat surface and can block foreign matter or moisture from penetrating. For example, the buffer layer 311 may contain an inorganic substance such as silicon oxide, silicon nitride, silicon oxynitride, aluminum oxide, aluminum nitride, titanium oxide, or titanium nitride, or an organic substance such as polyimide, polyester, or acrylic acid. A laminated body composed of a plurality of materials is formed.

薄膜電晶體(TFT)可包括活性層310、柵極電極320、源極電極330a及汲極電極330b。A thin film transistor (TFT) may include an active layer 310, a gate electrode 320, a source electrode 330a, and a drain electrode 330b.

以下,對薄膜電晶體(TFT)為依序形成有活性層310、柵極電極320、源極電極330a及汲極電極330b的頂柵極型(top gate type)的情況進行說明。然而,本實施例並不限定於此,可使用底柵極型(bottom gate type)等各種類型的薄膜電晶體(TFT)。Hereinafter, a case where a thin film transistor (TFT) is a top gate type in which an active layer 310, a gate electrode 320, a source electrode 330a, and a drain electrode 330b are sequentially formed is described. However, this embodiment is not limited to this, and various types of thin film transistors (TFTs) such as a bottom gate type can be used.

活性層310可包括半導體物質、例如非晶矽(amorphous silicon)或多晶矽(poly crystalline silicon)。然而,本實施例並不限定於此,活性層310可含有各種物質。作為選擇性實施例,活性層310可含有有機半導體物質等。The active layer 310 may include a semiconductor substance, such as amorphous silicon or poly crystalline silicon. However, this embodiment is not limited to this, and the active layer 310 may contain various substances. As an alternative embodiment, the active layer 310 may contain an organic semiconductor substance or the like.

作為又一選擇性實施例,活性層310可含有氧化物半導體物質。例如,活性層310可包括選自如鋅(Zn)、銦(In)、鎵(Ga)、錫(Sn)、鎘(Cd)、鍺(Ge)等的12、13、14族金屬元素及其組合中的物質的氧化物。As yet another alternative embodiment, the active layer 310 may contain an oxide semiconductor substance. For example, the active layer 310 may include Groups 12, 13, and 14 metal elements selected from, for example, zinc (Zn), indium (In), gallium (Ga), tin (Sn), cadmium (Cd), germanium (Ge), and the like, and Oxides of substances in the combination.

柵極絕緣膜(gate insulating layer)313形成到活性層310上。柵極絕緣膜313發揮將活性層310與柵極電極320絕緣的作用。柵極絕緣膜313中包括氧化矽及/或氮化矽等無機物質的膜可形成為多層或單層。A gate insulating layer 313 is formed on the active layer 310. The gate insulating film 313 functions to insulate the active layer 310 from the gate electrode 320. The film of the gate insulating film 313 including an inorganic substance such as silicon oxide and / or silicon nitride may be formed as a multilayer or a single layer.

柵極電極320形成到柵極絕緣膜313的上部。柵極電極320可與對薄膜電晶體(TFT)施加接通/斷開信號的柵極線(未圖示)連接。The gate electrode 320 is formed to an upper portion of the gate insulating film 313. The gate electrode 320 may be connected to a gate line (not shown) that applies an on / off signal to a thin film transistor (TFT).

柵極電極320可由低電阻金屬物質構成。考慮與相鄰層的密接性、積層的層的表面平坦性及加工性等,柵極電極320例如可由鋁(Al)、鉑(Pt)、鈀(Pd)、銀(Ag)、鎂(Mg)、金(Au)、鎳(Ni)、釹(Nd)、銥(Ir)、鉻(Cr)、鋰(Li)、鈣(Ca)、鉬(Mo)、鈦(Ti)、鎢(W)、銅(Cu)中的一種以上的物質形成為單層或多層。The gate electrode 320 may be made of a low-resistance metal substance. The gate electrode 320 may be made of, for example, aluminum (Al), platinum (Pt), palladium (Pd), silver (Ag), or magnesium (Mg). ), Gold (Au), nickel (Ni), neodymium (Nd), iridium (Ir), chromium (Cr), lithium (Li), calcium (Ca), molybdenum (Mo), titanium (Ti), tungsten (W ), One or more of copper (Cu) is formed as a single layer or multiple layers.

在柵極電極320上形成層間絕緣膜315。層間絕緣膜315將源極電極330a及汲極電極330b與柵極電極320絕緣。層間絕緣膜315中包括無機物質的膜可形成為多層或單層。例如,無機物質可為金屬氧化物或金屬氮化物,具體而言,無機物質可包括氧化矽(SiO2 )、氮化矽(SiNx )、氮氧化矽(SiON)、氧化鋁(Al2 O3 )、氧化鈦(TiO2 )、氧化鉭(Ta2 O5 )、氧化鉿(HfO2 )或氧化鋅(ZrO2 )等。An interlayer insulating film 315 is formed on the gate electrode 320. The interlayer insulating film 315 insulates the source electrode 330 a and the drain electrode 330 b from the gate electrode 320. A film including an inorganic substance in the interlayer insulating film 315 may be formed as a multilayer or a single layer. For example, the inorganic substance may be a metal oxide or a metal nitride. Specifically, the inorganic substance may include silicon oxide (SiO 2 ), silicon nitride (SiN x ), silicon oxynitride (SiON), and aluminum oxide (Al 2 O 3 ), titanium oxide (TiO 2 ), tantalum oxide (Ta 2 O 5 ), hafnium oxide (HfO 2 ), or zinc oxide (ZrO 2 ).

在層間絕緣膜315上形成源極電極330a及汲極電極330b。源極電極330a及汲極電極330b可由鋁(Al)、鉑(Pt)、鈀(Pd)、銀(Ag)、鎂(Mg)、金(Au)、鎳(Ni)、釹(Nd)、銥(Ir)、鉻(Cr)、鋰(Li)、鈣(Ca)、鉬(Mo)、鈦(Ti)、鎢(W)、銅(Cu)中的一種以上的物質形成為單層或多層。源極電極330a及汲極電極330b分別電連接到活性層310的源極區域與汲極區域。A source electrode 330a and a drain electrode 330b are formed on the interlayer insulating film 315. The source electrode 330a and the drain electrode 330b may be made of aluminum (Al), platinum (Pt), palladium (Pd), silver (Ag), magnesium (Mg), gold (Au), nickel (Ni), neodymium (Nd), One or more of iridium (Ir), chromium (Cr), lithium (Li), calcium (Ca), molybdenum (Mo), titanium (Ti), tungsten (W), and copper (Cu) are formed as a single layer or Multiple layers. The source electrode 330a and the drain electrode 330b are electrically connected to the source region and the drain region of the active layer 310, respectively.

平坦化層317形成到薄膜電晶體(TFT)上。平坦化層317以覆蓋薄膜電晶體(TFT)的方式形成,從而可消除因薄膜電晶體(TFT)形成的階差而使上表面變平坦。平坦化層317中包括有機物質的膜可形成為單層或多層。有機物質可包括如聚甲基丙烯酸甲酯(Polymethylmethacrylate,PMMA)或聚苯乙烯(Polystylene,PS)的普通的通用聚合物、具有酚類基團的聚合物衍生物、丙烯酸類聚合物、醯亞胺類聚合物、芳醚類聚合物、醯胺類聚合物、氟類聚合物、對二甲苯類聚合物、乙烯醇類聚合物及其摻合物等。另外,平坦化層317也可由無機絕緣膜與有機絕緣膜的複合積層體形成。The planarization layer 317 is formed on a thin film transistor (TFT). The planarization layer 317 is formed to cover a thin film transistor (TFT), so that the upper surface can be flattened due to a step difference formed by the thin film transistor (TFT). The film including an organic substance in the planarization layer 317 may be formed as a single layer or multiple layers. Organic substances may include common general polymers such as polymethylmethacrylate (PMMA) or polystylene (PS), polymer derivatives with phenolic groups, acrylic polymers, fluorene Amine polymers, aryl ether polymers, amidine polymers, fluorine polymers, paraxylene polymers, vinyl alcohol polymers and blends thereof. The planarizing layer 317 may be formed of a composite laminate of an inorganic insulating film and an organic insulating film.

在平坦化層317上定位有第一電極510。第一電極510可與薄膜電晶體(TFT)電連接。具體而言,第一電極510可藉由形成在平坦化層317的接觸孔與汲極電極330b電連接。第一電極510可具有各種形態,例如可以島嶼形態圖案化而形成。可在平坦化層317上配置定義像素區域的障壁層400。障壁層400可包括收容微LED100的凹陷部。作為一例,障壁層400可包括形成凹陷部的第一障壁層410。可根據微LED100的高度及視角來決定第一障壁層410的高度。可根據顯示裝置的解析度、像素密度等來決定凹陷部的尺寸(寬度)。在一實施例中,微LED100的高度可大於第一障壁層410的高度。凹陷部可呈剖面為四邊形的形狀,但本發明的實施例並不限定於此,凹陷部的剖面可呈多邊形、矩形、圓形、圓錐形、橢圓形、三角形等各種形狀。A first electrode 510 is positioned on the planarization layer 317. The first electrode 510 may be electrically connected to a thin film transistor (TFT). Specifically, the first electrode 510 may be electrically connected to the drain electrode 330 b through a contact hole formed in the planarization layer 317. The first electrode 510 may have various shapes, for example, may be formed by patterning in an island shape. A barrier layer 400 defining a pixel region may be disposed on the planarization layer 317. The barrier layer 400 may include a recessed portion that receives the micro LED 100. As an example, the barrier layer 400 may include a first barrier layer 410 forming a recessed portion. The height of the first barrier layer 410 may be determined according to the height and viewing angle of the micro LED 100. The size (width) of the recessed portion can be determined according to the resolution, pixel density, and the like of the display device. In one embodiment, the height of the micro LED 100 may be greater than the height of the first barrier layer 410. The recessed portion may have a quadrangular cross-section, but the embodiment of the present invention is not limited thereto, and the cross-section of the recessed portion may have various shapes such as a polygon, a rectangle, a circle, a cone, an oval, and a triangle.

障壁層400還可包括第一障壁層410上部的第二障壁層420。第一障壁層410與第二障壁層420可具有階差,第二障壁層420的寬度小於第一障壁層410的寬度。可在第二障壁層420的上部配置導電層550。導電層550可沿與資料線或掃描線平行的方向配置,與第二電極530電連接。然而,本發明並不限定於此,可省略第二障壁層420而在第一障壁層410上配置導電層550。或者,也可省略第二障壁層420及導電層550而將第二電極530作為像素(P)共通的共通電極形成到顯示基板301整體。第一障壁層410及第二障壁層420可包括吸收光的至少一部分的物質、光反射物質或光散射物質。第一障壁層410及第二障壁層420可包括相對於可見光(例如,380 nm至750 nm的波長範圍的光)為半透明或不透明的絕緣物質。The barrier layer 400 may further include a second barrier layer 420 above the first barrier layer 410. The first barrier layer 410 and the second barrier layer 420 may have a step difference, and a width of the second barrier layer 420 is smaller than a width of the first barrier layer 410. A conductive layer 550 may be disposed on an upper portion of the second barrier layer 420. The conductive layer 550 may be disposed in a direction parallel to the data line or the scan line, and is electrically connected to the second electrode 530. However, the present invention is not limited to this, and the second barrier layer 420 may be omitted and the conductive layer 550 may be disposed on the first barrier layer 410. Alternatively, the second barrier layer 420 and the conductive layer 550 may be omitted, and the second electrode 530 may be formed as a common electrode common to the pixels (P) to the entire display substrate 301. The first barrier layer 410 and the second barrier layer 420 may include a substance that absorbs at least a portion of light, a light reflecting substance, or a light scattering substance. The first barrier layer 410 and the second barrier layer 420 may include an insulating substance that is translucent or opaque with respect to visible light (for example, light in a wavelength range of 380 nm to 750 nm).

作為一例,第一障壁層410及第二障壁層420可由聚碳酸酯(PC)、聚對苯二甲酸乙二酯(PET)、聚醚碸、聚乙烯醇縮丁醛、聚苯醚、聚醯胺、聚醚醯亞胺、降冰片烯(norbornene system)樹脂、甲基丙烯酸樹脂、環狀聚烯類等熱塑性樹脂、環氧樹脂、酚樹脂、氨基甲酸酯樹脂、丙烯酸樹脂、乙烯酯樹脂、醯亞胺類樹脂、氨基甲酸酯類樹脂、尿素(urea)樹脂、三聚氰胺(melamine)樹脂等熱固性樹脂、或聚苯乙烯、聚丙烯腈等有機絕緣物質形成,但並不限定於此。As an example, the first barrier layer 410 and the second barrier layer 420 may be made of polycarbonate (PC), polyethylene terephthalate (PET), polyether fluorene, polyvinyl butyral, polyphenylene ether, polyphenylene Thermoplastic resins such as amidine, polyetherimide, norbornene system resin, methacrylic resin, cyclic polyenes, epoxy resin, phenol resin, urethane resin, acrylic resin, vinyl ester The resin, the sulfonyl imide-based resin, the urethane-based resin, the urea resin, the melamine resin, or the like, or an organic insulating material such as polystyrene or polyacrylonitrile is not limited thereto.

作為另一例,第一障壁層410及第二障壁層420可由SiOx 、SiNx 、SiNx Oy 、AlOx 、TiOx 、TaOx 、ZnOx 等無機氧化物、無機氮化物等無機絕緣物質形成,但並不限定於此。在一實施例中,第一障壁層410及第二障壁層420可由如黑矩陣(black matrix)材料的不透明材料形成。作為絕緣性黑矩陣材料,可包括有機樹脂、包括玻璃漿(glass paste)及黑色顏料的樹脂或漿料、金屬粒子、例如鎳、鋁、鉬及其合金、金屬氧化物粒子(例如,鉻氧化物)、或金屬氮化物粒子(例如,鉻氮化物)等。在變形例中,第一障壁層410及第二障壁層420可為由具有高反射率的分散的布勒格反射體(DBR)或金屬形成的鏡面反射體。As another example, the first barrier layer 410 and the second barrier layer 420 may be made of inorganic insulating materials such as inorganic oxides such as SiO x , SiN x , SiN x O y , AlO x , TiO x , TaO x , and ZnO x , and inorganic nitrides. Formation, but it is not limited to this. In one embodiment, the first barrier layer 410 and the second barrier layer 420 may be formed of an opaque material such as a black matrix material. As the insulating black matrix material, organic resins, resins or pastes including glass paste and black pigments, metal particles such as nickel, aluminum, molybdenum and alloys thereof, and metal oxide particles (for example, chromium oxide) can be included. Material), or metal nitride particles (for example, chromium nitride). In a modified example, the first barrier layer 410 and the second barrier layer 420 may be specular reflectors formed of a dispersed Bragg reflector (DBR) having a high reflectance or a metal.

在凹陷部配置微LED100。微LED100可在凹陷部與第一電極510電連接。The micro LED 100 is disposed in the recessed portion. The micro LED 100 may be electrically connected to the first electrode 510 in the recessed portion.

微LED100射出具有紅色、綠色、藍色、白色等波長的光,也可藉由利用螢光物質或將顏色組合而實現白色光。微LED100具有1 μm至100 μm的尺寸。藉由根據本發明的實施例的微LED吸附體從生長基板101上拾取(pick up)單個或多個微LED100而轉移到顯示基板301,由此可收容到顯示基板301的凹陷部。The micro LED 100 emits light having wavelengths of red, green, blue, and white, and white light can also be realized by using a fluorescent substance or combining colors. The micro LED 100 has a size of 1 μm to 100 μm. The single or multiple micro LEDs 100 are picked up from the growth substrate 101 and transferred to the display substrate 301 by the micro LED adsorber according to the embodiment of the present invention, thereby being able to be accommodated in the recessed portion of the display substrate 301.

微LED100包括p-n二極體、配置在p-n二極體的一側的第一接觸電極106及位於與第一接觸電極106相反側的第二接觸電極107。第一接觸電極106可與第一電極510連接,第二接觸電極107與第二電極530連接。The micro LED 100 includes a p-n diode, a first contact electrode 106 disposed on one side of the p-n diode, and a second contact electrode 107 on the opposite side of the first contact electrode 106. The first contact electrode 106 may be connected to the first electrode 510, and the second contact electrode 107 is connected to the second electrode 530.

第一電極510可配備由Ag、Mg、Al、Pt、Pd、Au、Ni、Nd、Ir、Cr及其化合物等形成的反射膜、及形成在反射膜上的透明或半透明電極層。透明或半透明電極層可具備選自包括氧化銦錫(ITO,indium tin oxide)、氧化銦鋅(IZO,indium zinc oxide)、氧化鋅(ZnO,zinc oxide)、氧化銦(In2 O3 ,indium oxide)、氧化銦鎵(IGO,indium gallium oxide)及氧化鋅鋁(AZO,aluminum zinc oxide)的族群中的至少一種以上。The first electrode 510 may be provided with a reflective film formed of Ag, Mg, Al, Pt, Pd, Au, Ni, Nd, Ir, Cr, and a compound thereof, and a transparent or translucent electrode layer formed on the reflective film. The transparent or translucent electrode layer may be selected from the group consisting of indium tin oxide (ITO), indium zinc oxide (IZO), zinc oxide (ZnO, zinc oxide), and indium oxide (In 2 O 3) . at least one of the groups of indium oxide (IGO), indium gallium oxide (IGO), and aluminum zinc oxide (AZO).

鈍化層520包覆凹陷部內的微LED100。鈍化層520填充障壁層400與微LED100之間的空間,由此覆蓋凹陷部及第一電極510。鈍化層520可由有機絕緣物質形成。例如,鈍化層520可由丙烯酸、聚甲基丙烯酸甲酯(PMMA)、苯并環丁烯(BCB)、聚醯亞胺、丙烯酸酯、環氧樹脂及聚酯等形成,但並不限定於此。The passivation layer 520 covers the micro LED 100 in the recess. The passivation layer 520 fills a space between the barrier layer 400 and the micro LED 100, thereby covering the recessed portion and the first electrode 510. The passivation layer 520 may be formed of an organic insulating substance. For example, the passivation layer 520 may be formed of acrylic, polymethylmethacrylate (PMMA), benzocyclobutene (BCB), polyimide, acrylate, epoxy resin, polyester, and the like, but is not limited thereto. .

鈍化層520以不覆蓋微LED100的上部、例如第二接觸電極107的高度形成,從而第二接觸電極107露出。可在鈍化層520上部形成與微LED100的露出的第二接觸電極107電連接的第二電極530。The passivation layer 520 is formed at a height that does not cover the upper portion of the micro LED 100, for example, the second contact electrode 107, so that the second contact electrode 107 is exposed. A second electrode 530 electrically connected to the exposed second contact electrode 107 of the micro LED 100 may be formed on the passivation layer 520.

第二電極530可配置到微LED100與鈍化層520上。第二電極530可由ITO、IZO、ZnO或In2 O3 等透明導電性物質形成。The second electrode 530 may be disposed on the micro LED 100 and the passivation layer 520. The second electrode 530 may be formed of a transparent conductive material such as ITO, IZO, ZnO, or In 2 O 3 .

以下,參照圖3(a)及圖3(b),對本發明的較佳實施例進行說明。Hereinafter, a preferred embodiment of the present invention will be described with reference to FIGS. 3 (a) and 3 (b).

圖3(a)是繪示根據本發明的較佳實施例的微LED吸附體1000吸附微LED100前的狀態的圖,圖3(b)是繪示根據本發明的較佳實施例的微LED吸附體1000吸附微LED100的狀態的圖。根據本發明的實施例的微LED吸附體1000為如下的真空吸附體:包括具有氣孔的多孔性部件1100及遮罩1400,遮罩1400配備在多孔性部件1100的下部且具有開口部1110,由此可藉由遮罩1400使微LED100容易地吸附到多孔性部件1100的下部表面。FIG. 3 (a) is a diagram illustrating a state before the micro LED adsorbent 1000 adsorbs the micro LED 100 according to a preferred embodiment of the present invention, and FIG. 3 (b) is a diagram illustrating a micro LED according to a preferred embodiment of the present invention A diagram of a state where the adsorbent 1000 adsorbs the micro LED 100. The micro LED adsorbent 1000 according to the embodiment of the present invention is a vacuum adsorbent including a porous member 1100 having pores and a mask 1400. The mask 1400 is provided at a lower portion of the porous member 1100 and has an opening 1110. This allows the micro LED 100 to be easily adsorbed to the lower surface of the porous member 1100 by the mask 1400.

在多孔性部件1100的上部配備真空腔室1200。真空腔室1200連接到供給真空或解除真空的真空埠。真空腔室1200發揮藉由真空埠的動作而對多孔性部件1100的多個氣孔施加真空或解除施加到氣孔的真空的功能。將真空腔室1200結合到多孔性部件1100的構造只要為在對多孔性部件1100施加真空或解除所施加的真空時防止真空向其他部位洩漏的適當的構造,則無限定。A vacuum chamber 1200 is provided above the porous member 1100. The vacuum chamber 1200 is connected to a vacuum port supplying or releasing a vacuum. The vacuum chamber 1200 has a function of applying a vacuum to a plurality of pores of the porous member 1100 or releasing a vacuum applied to the pores by the operation of a vacuum port. The structure in which the vacuum chamber 1200 is coupled to the porous member 1100 is not limited as long as it is a suitable structure that prevents the vacuum from leaking to other parts when a vacuum is applied to the porous member 1100 or the applied vacuum is released.

在真空吸附微LED100時,施加到真空腔室1200的真空傳遞到多孔性部件1100的多個氣孔,從而對微LED100產生真空吸附力。另一方面,在解吸微LED100時,因解除施加到真空腔室1200的真空而也對多孔性部件1100的多個氣孔解除真空,從而去除對微LED100的真空吸附力。When the micro LED 100 is vacuum-adsorbed, the vacuum applied to the vacuum chamber 1200 is transmitted to a plurality of pores of the porous member 1100, thereby generating a vacuum adsorption force on the micro LED 100. On the other hand, when the micro LED 100 is desorbed, the vacuum applied to the vacuum chamber 1200 is released, and the plurality of pores of the porous member 1100 are also evacuated, thereby removing the vacuum adsorption force on the micro LED 100.

多孔性部件1100在內部包括含有多個氣孔的物質而構成,作為固定排列或無序的氣孔構造,可構成為具有0.2至0.95左右的氣孔度的粉末、薄膜/厚膜及塊狀形態。多孔性部件1100的氣孔可根據其尺寸而分為直徑為2 nm以下的微(micro)氣孔、2 nm至50 nm的中(meso)氣孔、50 nm以上的巨大(macro)氣孔,包括這些氣孔中的至少一部分。多孔性部件1100可根據其構成成分而分為有機、無機(陶瓷)、金屬、混合型多孔性原材料。多孔性部件1100包括以固定排列形成氣孔的陽極氧化膜。多孔性部件1100在形狀方面可為粉末、塗覆膜、塊狀,在為粉末的情況下,可為球形、中空球形、纖維、管形等各種形狀,雖有直接使用粉末的情況,但也可將其作為起始物質而製造塗覆膜、塊狀形狀來使用。The porous member 1100 is composed of a substance containing a plurality of pores inside. As a fixed arrangement or a disordered pore structure, the porous member 1100 can be formed into a powder, a thin film / thick film, and a block shape having a porosity of about 0.2 to 0.95. The pores of the porous member 1100 can be divided into micro pores with a diameter of 2 nm or less, meso pores with a diameter of 2 nm to 50 nm, and macro pores with a diameter of 50 nm or more, including these pores. At least a part of. The porous member 1100 can be classified into organic, inorganic (ceramic), metal, and hybrid porous raw materials according to its constituent components. The porous member 1100 includes an anodized film in which pores are formed in a fixed arrangement. The shape of the porous member 1100 can be powder, coating film, or block. In the case of a powder, the porous member 1100 can have various shapes such as a spherical shape, a hollow spherical shape, a fiber, and a tube shape. Although the powder is directly used, it may be This can be used as a starting material to produce a coating film or a block shape.

在多孔性部件1100的氣孔呈無序的氣孔構造的情況下,在多孔性部件1100的內部,多個氣孔彼此連接而形成連接多孔性部件1100的上下的空氣流路。另一方面,在多孔性部件1100的氣孔呈垂直形狀的氣孔構造的情況下,多孔性部件1100的內部可藉由垂直形狀的氣孔貫通多孔性部件1100的上下而形成空氣流路。When the pores of the porous member 1100 have a disordered pore structure, a plurality of pores are connected to each other inside the porous member 1100 to form an air flow path connecting the upper and lower portions of the porous member 1100. On the other hand, when the pores of the porous member 1100 have a vertical pore structure, the inside of the porous member 1100 can penetrate the upper and lower sides of the porous member 1100 through the vertical pores to form an air flow path.

在多孔性部件1100的下部配備遮罩1400,所述遮罩具有開口部1110,未形成開口部1110的面形成非吸附區域1130。A mask 1400 is provided below the porous member 1100. The mask has an opening 1110, and a non-adsorption region 1130 is formed on a surface on which the opening 1110 is not formed.

如圖4所示,遮罩1400形成有開口部1110,在未形成開口部1110的面形成非吸附區域1130。As shown in FIG. 4, the mask 1400 is formed with an opening portion 1110, and a non-adsorption region 1130 is formed on a surface on which the opening portion 1110 is not formed.

在生長基板101上的微LED100的列方向間距為P(n)且行方向間距為P(m)的情況下,開口部1110可按照與生長基板101上的微LED100的間距相同的間距形成。換句話說,在生長基板101上的微LED100的列方向間距為P(n)且行方向間距為P(m)的情況下,遮罩1400的開口部1110的列方向間距為P(n),行方向間距為P(m)。由於如上所述的構成,在多孔性部件1100的下部配備遮罩1400的微LED吸附體1000可一次真空吸附生長基板101上的所有微LED100而傳送。When the pitch in the column direction of the microLEDs 100 on the growth substrate 101 is P (n) and the pitch in the row direction is P (m), the openings 1110 may be formed at the same pitch as the pitch of the microLEDs 100 on the growth substrate 101. In other words, when the column-direction pitch of the micro LEDs 100 on the growth substrate 101 is P (n) and the row-direction pitch is P (m), the column-direction pitch of the openings 1110 of the mask 1400 is P (n), The pitch in the row direction is P (m). Due to the structure described above, the micro LED adsorbent 1000 provided with the mask 1400 under the porous member 1100 can vacuum-adsorb all the micro LEDs 100 on the growth substrate 101 and transfer them.

開口部1110的面積可形成為大於微LED100的上部面的水平面積。換句話說,開口部1110的直徑D可形成為大於微LED100的上部面的水平長度。在開口部1110的面積形成為大於微LED100的上部面的水平面積的情況下,本發明可實現為如圖3(a)及圖3(b)的實施例。The area of the opening portion 1110 may be formed to be larger than the horizontal area of the upper surface of the micro LED 100. In other words, the diameter D of the opening portion 1110 may be formed to be larger than the horizontal length of the upper surface of the micro LED 100. In a case where the area of the opening portion 1110 is formed to be larger than the horizontal area of the upper surface of the micro LED 100, the present invention can be implemented as the embodiment shown in FIGS. 3 (a) and 3 (b).

如圖3(a)及圖3(b)所示,遮罩1400配備在多孔性部件1100的下部。遮罩1400藉由多孔性部件1100的真空吸入力吸附到多孔性部件1100而配備。As shown in FIGS. 3 (a) and 3 (b), the mask 1400 is provided under the porous member 1100. The mask 1400 is provided by being adsorbed to the porous member 1100 by a vacuum suction force of the porous member 1100.

圖3(a)是繪示配備具有面積大於微LED100的上部面的水平面積的開口部1110的遮罩1400的微LED吸附體1000吸附微LED100前的狀態的圖。如圖3(a)所示,多孔性部件1100的下部表面呈因遮罩1400而形成非吸附區域1130及開口部1110的形狀。FIG. 3 (a) is a diagram illustrating a state before the micro LED absorber 1000 is equipped with a mask 1400 having an opening 1110 having an area larger than a horizontal area of an upper surface of the micro LED 100 before the micro LED 100 is adsorbed. As shown in FIG. 3 (a), the lower surface of the porous member 1100 has a shape in which a non-adsorption region 1130 and an opening 1110 are formed by the mask 1400.

遮罩1400的非吸附區域1130為因遮罩1400具有開口部1110而形成的區域,因此具有與遮罩1400相同的厚度,由此可與開口部1110形成階差。The non-adsorption region 1130 of the mask 1400 is a region formed by the mask 1400 having the opening portion 1110, and therefore has the same thickness as the mask 1400, and thus can form a step with the opening portion 1110.

遮罩1400的非吸附區域1130發揮堵塞多孔性部件1100的下部表面的氣孔的功能,因此起到在多孔性部件1100上形成遮蔽部的作用。因此,由真空腔室1200的真空傳遞到多孔性部件1100而形成的真空壓可藉由遮罩1400的開口部1110更大地形成。微LED100可藉由形成較大真空壓的開口部1110而有效地吸附到多孔性部件1100的下部表面。The non-adsorption region 1130 of the mask 1400 has a function of blocking the pores on the lower surface of the porous member 1100, and thus functions as a shielding portion in the porous member 1100. Therefore, the vacuum pressure formed by transmitting the vacuum of the vacuum chamber 1200 to the porous member 1100 can be made larger by the opening portion 1110 of the mask 1400. The micro LED 100 can be efficiently adsorbed to the lower surface of the porous member 1100 by forming the opening 1110 having a large vacuum pressure.

圖3(b)是繪示配備具有面積大於微LED100的上部面的水平面積的開口部1110的遮罩1400的微LED吸附體1000吸附微LED100的狀態的圖。如圖3(b)所示,在微LED吸附體1000中,配備在多孔性部件1100的下部的遮罩1400的非吸附區域1130發揮遮蔽部的作用而堵塞多孔性部件1100的下部的一部分表面,因此形成較大的真空壓的開口部1110形成為吸附微LED100的吸附區域而真空吸附微LED100。FIG. 3 (b) is a diagram showing a state in which the micro LED 100 is adsorbed by the micro LED adsorber 1000 equipped with the mask 1400 having the opening portion 1110 having an area larger than the horizontal area of the upper surface of the micro LED 100. As shown in FIG. 3 (b), in the micro LED adsorbent 1000, the non-adsorption region 1130 of the mask 1400 provided at the lower portion of the porous member 1100 functions as a shielding portion and blocks a part of the surface of the lower portion of the porous member 1100. Therefore, the opening portion 1110 forming a large vacuum pressure is formed to adsorb the micro LED 100 in an adsorption area and vacuum adsorb the micro LED 100.

如果像圖3(a)及圖3(b)一樣在多孔性部件1100的下部配備具有面積大於微LED100的上部面的水平面積的尺寸的開口部1110的遮罩1400,則因遮罩1400的開口部1110而使微LED100直接與均勻的平坦度的多孔性部件1100的下部表面接觸並真空吸附,因此可防止在真空吸附時發生微LED100的脫落。If the lower part of the porous member 1100 is provided with a mask 1400 having an opening portion 1110 having a size larger than the horizontal area of the upper surface of the micro LED 100 as in FIGS. 3 (a) and 3 (b), The opening 1110 directly contacts the micro LED 100 with the lower surface of the porous member 1100 having a uniform flatness and vacuum-adsorbs the micro-LED 100. Therefore, the micro-LED 100 can be prevented from falling off during vacuum adsorption.

這種情況可藉由如下方式實現:由真空腔室1200傳遞真空而成的多孔性部件1100的真空壓因遮罩1400的開口部1110而更大地形成,從而可更充分地執行將微LED100真空吸附到均勻的平坦度的多孔性部件1100的下部表面的功能。This situation can be achieved by the vacuum pressure of the porous member 1100 formed by transmitting the vacuum from the vacuum chamber 1200 to the opening 1110 of the mask 1400, and the micro LED 100 can be more fully vacuumed. The function of adsorbing the lower surface of the porous member 1100 with uniform flatness.

另外,在微LED吸附體1000配備開口部1110的面積形成為大於微LED100的上部面的水平面積的尺寸的遮罩1400的情況下,微LED吸附體1000可不使微LED100產生因微LED100的上部面的外側與遮罩1400的非吸附區域1130的階差部卡碰引起的損傷而容易地真空吸附微LED100。In addition, when the micro LED adsorbent 1000 is provided with the mask 1400 having an opening 1110 having an area larger than the horizontal area of the upper surface of the micro LED 100, the micro LED adsorbent 1000 may not cause the micro LED 100 to generate an upper portion of the micro LED 100. The micro LED 100 is easily vacuum-adsorbed due to damage caused by a collision between the outside of the surface and the stepped portion of the non-adsorption region 1130 of the mask 1400.

遮罩1400可改變列方向間距及行方向間距而配備。The mask 1400 is provided by changing the pitch in the column direction and the pitch in the row direction.

圖5至圖7是繪示改變本發明的實施例的遮罩1400的列方向間距或行方向間距的實施例的圖。5 to 7 are diagrams illustrating an embodiment in which the pitch in the column direction or the pitch in the row direction of the mask 1400 according to the embodiment of the present invention is changed.

如圖5所示,遮罩1400在生長基板101上的微LED100的列方向間距為P(n)且行方向間距為P(m)的情況下,開口部1110的列方向間距可為3P(n),行方向間距為P(m)。此處,3P(n)是指圖4所示的列方向間距P(n)的3倍。根據如上所述的構成,可僅真空吸附與3倍的列對應的微LED100而傳送。此處,以3倍的列傳送的微LED100可為紅色(Red)LED、綠色(Green)LED、藍色(Blue)LED、白色(white)LED中的任一種。根據如上所述的構成,能夠以3P(n)間距隔開安裝到顯示基板301的相同的發光色的微LED100而轉移。As shown in FIG. 5, when the pitch of the micro LEDs 100 of the mask 1400 on the growth substrate 101 is P (n) and the pitch of the row direction is P (m), the pitch of the openings 1110 in the column direction may be 3P (n ), The spacing in the row direction is P (m). Here, 3P (n) means three times the column direction pitch P (n) shown in FIG. 4. According to the configuration described above, only the micro LEDs 100 corresponding to three times the rows can be vacuum-adsorbed and transferred. Here, the micro LEDs 100 transmitted in three-fold columns may be any one of a red LED, a green LED, a blue LED, and a white LED. According to the configuration described above, the micro LEDs 100 of the same light emission color mounted on the display substrate 301 can be shifted at intervals of 3P (n).

如圖6所示,遮罩1400在生長基板101上的微LED100的列方向間距為P(n)且行方向間距為P(m)的情況下,開口部1110的列方向間距可為P(n),行方向間距為3P(m)。此處,3P(m)是指圖4所示的行方向間距P(m)的3倍。根據如上所述的構成,可僅真空吸附與3倍的行對應的微LED100而傳送。此處,以3倍的行傳送的微LED100可為紅色(Red)LED、綠色(Green)LED、藍色(Blue)LED、白色(white)LED中的任一種。根據如上所述的構成,能夠以3P(m)間距隔開安裝到顯示基板301的相同的發光色的微LED100而轉移。As shown in FIG. 6, when the column direction pitch of the micro LEDs 100 on the growth substrate 101 of the mask 1400 is P (n) and the row direction pitch is P (m), the column direction pitch of the openings 1110 may be P (n ), The spacing in the row direction is 3P (m). Here, 3P (m) means 3 times the pitch P (m) in the row direction shown in FIG. 4. According to the configuration described above, only the micro LEDs 100 corresponding to three times the rows can be vacuum-sucked and transferred. Here, the micro LEDs 100 transmitted in three-fold rows may be any one of a red LED, a green LED, a blue LED, and a white LED. According to the configuration described above, the micro LEDs 100 of the same light emission color mounted on the display substrate 301 can be shifted at intervals of 3 P (m).

如圖7所示,遮罩1400在生長基板101上的微LED100的列方向間距為P(n)且行方向間距為P(m)的情況下,開口部1110可沿對角線方向形成,列方向與行方向上的間距分別形成為3P(n)及3P(m)。此處,以3倍的行及3倍的列傳送的微LED100可為紅色(Red)LED、綠色(Green)LED、藍色(Blue)LED、白色(white)LED中的任一種。根據如上所述的構成,以3P(n)及3P(m)間距隔開安裝到顯示基板301的相同發光色的微LED100,由此可沿對角線方向轉移相同的發光色的微LED100。As shown in FIG. 7, when the pitch of the micro LEDs 100 of the mask 1400 on the growth substrate 101 is P (n) and the pitch of the row direction is P (m), the openings 1110 may be formed in a diagonal direction. The pitches in the direction and the row direction are formed as 3P (n) and 3P (m), respectively. Here, the micro LEDs 100 transmitted in three times the rows and three times the columns may be any one of a red LED, a green LED, a blue LED, and a white LED. According to the configuration as described above, the micro LEDs 100 of the same light emission color mounted on the display substrate 301 are spaced apart at a pitch of 3P (n) and 3P (m), so that the micro LEDs 100 of the same light emission color can be transferred in a diagonal direction.

遮罩1400可由鎳鋼(invar)材質、陽極氧化膜、金屬材質、膜材質、紙材質等各種材質形成而配備。The mask 1400 can be formed of various materials such as nickel steel (invar) material, anodized film, metal material, film material, paper material, and the like.

鎳鋼材質的熱膨脹係數較低,因此可防止因熱影響引起的介面變形。另外,與多孔性陶瓷相似的陽極氧化膜也具有受熱的影響較小的特性,因此在遮罩1400由鎳鋼材質或陽極氧化膜材質形成的情況下,具有可防止因熱影響引起的如介面變形的問題的效果。The low thermal expansion coefficient of the nickel steel material prevents interface deformation due to thermal effects. In addition, similar to porous ceramics, the anodic oxide film also has the characteristics of being less affected by heat. Therefore, when the mask 1400 is formed of a nickel steel material or an anodized film material, it has the ability to prevent the interface caused by thermal effects. Deformation problem effect.

遮罩1400可由金屬材質形成而配備。金屬材質易於加工,故而可容易地形成遮罩1400的開口部1110。因此,在遮罩1400由金屬材質形成的情況下,具有可提高製造便利性的效果。The mask 1400 may be formed of a metal material and provided. Since the metal material is easy to process, the opening 1110 of the mask 1400 can be easily formed. Therefore, when the shield 1400 is formed of a metal material, there is an effect that manufacturing convenience can be improved.

另外,在遮罩1400為金屬材質的情況下,在利用金屬接合方式作為用以使微LED100接合到顯示基板301的第一接觸電極106的方法時,不對顯示基板301施加電源,藉由微LED吸附體1000的遮罩1400對微LED100的上表面進行加熱而加熱接合金屬(合金),從而可使微LED100接合到第一接觸電極106。In addition, when the mask 1400 is made of a metal material, when a metal bonding method is used as a method for bonding the micro LED 100 to the first contact electrode 106 of the display substrate 301, no power is applied to the display substrate 301, and the micro LED is used. The mask 1400 of the adsorbent 1000 heats the upper surface of the micro LED 100 and heat-bonds a metal (alloy), so that the micro LED 100 can be bonded to the first contact electrode 106.

另外,遮罩1400可由膜材質形成而配備。配備遮罩1400的微LED吸附體1000在吸附微LED100時,會在遮罩1400的表面附著異物。遮罩1400可進行清洗而再使用,但存在每次清洗遮罩1400較為繁瑣的問題。因此,在以膜材質配備遮罩1400的情況下,可獲得如下效果:在附著異物時,可去除遮罩1400本身而容易地進行更換來方便地使用。另外,遮罩1400可由紙材質形成而配備。由紙材質形成的遮罩1400在表面附著異物的情況下,也可不另外進行清洗過程而去除遮罩1400,由此可容易地進行更換,因此可方便地使用。The mask 1400 can be made of a film material. When the micro LED adsorbent 1000 equipped with the mask 1400 adsorbs the micro LED 100, foreign matter adheres to the surface of the mask 1400. The mask 1400 can be cleaned and reused, but there is a problem that the mask 1400 is complicated to clean each time. Therefore, when the mask 1400 is provided with a film material, when the foreign matter is attached, the mask 1400 itself can be removed and easily replaced for convenient use. The mask 1400 can be made of a paper material. When a foreign matter is adhered to the surface of the mask 1400 made of a paper material, the mask 1400 can be easily replaced without removing the cleaning process separately, and thus can be used conveniently.

遮罩1400除鎳鋼材質、陽極氧化膜、金屬材質、膜材質或紙材質以外,還可由彈性材質形成而配備。The mask 1400 can be made of an elastic material in addition to a nickel steel material, an anodized film, a metal material, a film material, or a paper material.

遮罩1400在由彈性材質形成的情況下,可發揮防止微LED100破損的緩衝作用。例如,以微LED吸附體1000與微LED100的上表面僅保持數μm至數十μm的間距而下降的方式調節。然而,微LED吸附體1000在為了吸附微LED100而下降的情況下,會難以細微地調節下降的位置。其原因在於:由於微LED吸附體1000的機械公差,即便以與微LED100的上表面保持數μm至數十μm的間距來下降的方式調節微LED吸附體1000,也會因公差範圍而較所調節的微LED吸附體1000的下降位置更下降。When the mask 1400 is formed of an elastic material, it can provide a cushioning effect to prevent the micro LED 100 from being damaged. For example, it is adjusted so that the upper surface of the micro LED adsorbent 1000 and the micro LED 100 only has a pitch of several μm to several tens μm and falls. However, when the micro LED adsorbent 1000 is lowered to adsorb the micro LED 100, it is difficult to finely adjust the lowered position. The reason is that, due to the mechanical tolerance of the micro LED adsorbent 1000, even if the micro LED adsorber 1000 is adjusted in such a manner as to keep a distance of several μm to several tens μm from the upper surface of the micro LED 100 to decrease, it will be more difficult due to the tolerance range. The lowered position of the adjusted micro LED adsorbent 1000 is further lowered.

在微LED吸附體1000較所調節的下降位置更下降的情況下,會產生與微LED100的上表面碰撞而使微LED100破損的問題。然而,在微LED吸附體1000所配備的遮罩1400為彈性材質的情況下,可由遮罩1400收容微LED吸附體1000的下降方向的傳送誤差,因此可發揮緩衝作用。When the micro LED adsorbent 1000 is lower than the adjusted lowering position, a problem occurs that the micro LED 100 is damaged due to collision with the upper surface of the micro LED 100. However, when the cover 1400 provided in the micro LED adsorbent 1000 is an elastic material, the conveyance error in the downward direction of the micro LED absorber 1000 can be accommodated by the mask 1400, and therefore, it can play a buffering role.

遮罩1400可改變開口部1110的形狀及面積尺寸而配備到微LED吸附體1000。The mask 1400 can be provided to the micro LED adsorbent 1000 by changing the shape and area size of the opening portion 1110.

在圖8及圖9中繪示有圖3(a)及圖3(b)所示的微LED吸附體1000的變形例。圖8所示的微LED吸附體1000在多孔性部件1100的下部配備開口部1110的面積尺寸與圖4所示的遮罩1400不同的遮罩1400。如圖8所示,微LED吸附體1000在多孔性部件1100的下部配備具有面積小於微LED100的上部面的水平面積的尺寸的開口部1110的遮罩1400。遮罩1400的開口部1110的面積形成為小於微LED100的上部面的水平面積的尺寸。換句話說,在多孔性部件1100的下部表面配備具有直徑D小於微LED100的上部面的水平長度的開口部1110的遮罩1400。圖8所示的微LED吸附體1000可藉由配備具有面積小於微LED100的上部面的水平面積的尺寸的開口部1110的遮罩1400的構成而增大對微LED100的真空吸附面積。FIGS. 8 and 9 illustrate modified examples of the micro LED adsorbent 1000 shown in FIGS. 3 (a) and 3 (b). The micro LED adsorbent 1000 shown in FIG. 8 is provided with a mask 1400 having an area and an opening size 1110 which are different from those of the mask 1400 shown in FIG. 4 in a lower portion of the porous member 1100. As shown in FIG. 8, the micro LED adsorbent 1000 is provided with a cover 1400 having an opening portion 1110 having an area smaller than the horizontal area of the upper surface of the micro LED 100 in the lower portion of the porous member 1100. The area of the opening portion 1110 of the mask 1400 is smaller than the horizontal area of the upper surface of the micro LED 100. In other words, the lower surface of the porous member 1100 is provided with a mask 1400 having an opening portion 1110 with a diameter D smaller than the horizontal length of the upper surface of the micro LED 100. The micro LED adsorbent 1000 shown in FIG. 8 can increase the vacuum adsorption area of the micro LED 100 by the configuration of the mask 1400 having the opening portion 1110 having an area smaller than the horizontal area of the upper surface of the micro LED 100.

圖9所示的微LED吸附體1000在多孔性部件1100的下部配備開口部1110的面積與圖4所示的遮罩1400相同,而開口部1110的形狀不同的遮罩1400。如圖9所示,微LED吸附體1000在多孔性部件1100的下部配備如下的遮罩1400:與多孔性部件1100的下部表面直接接觸的直接接觸面側的遮罩1400的開口部1110的內徑形成為大於微LED100的上部面的水平面積,越朝向微LED100的上部面側,則內徑越形成為大於直接接觸面側的開口部1110的內徑,從而傾斜地形成開口部1110的內側面。圖9所示的微LED吸附體1000配備具有如下的開口部1110的遮罩1400:以越朝向與多孔性部件1100的下部表面直接接觸的直接接觸面側則開口部1110的內徑越小的方式傾斜地形成所述開口部的內側面,開口部1110的最小內徑形成為大於微LED100的上部面的水平面積的尺寸。微LED吸附體1000藉由配備如上所述的遮罩1400的構成而可獲得如下效果:在真空吸附微LED100時,發揮可將微LED100導引至所述微LED可真空吸附到多孔性部件1100的下部表面的真空吸附位置的作用,從而可使微LED100準確地真空吸附到準確位置。The micro LED adsorbent 1000 shown in FIG. 9 is provided with a mask 1400 having the same area as the mask 1400 shown in FIG. 4 in the lower portion of the porous member 1100, and the mask 1400 having a different shape of the mask 1110. As shown in FIG. 9, the micro LED adsorbent 1000 is provided with a mask 1400 below the porous member 1100. The inside of the opening 1110 of the mask 1400 on the direct contact surface side that is in direct contact with the lower surface of the porous member 1100 is as follows. The diameter is formed to be larger than the horizontal area of the upper surface of the micro LED 100, and the inner diameter is formed to be larger than the inner diameter of the opening portion 1110 on the direct contact surface side as the upper surface side of the micro LED 100 is oriented. . The micro LED adsorbent 1000 shown in FIG. 9 is provided with a mask 1400 having an opening portion 1110 whose inner diameter becomes smaller as it faces the direct contact surface side which is in direct contact with the lower surface of the porous member 1100. The inner side surface of the opening is formed obliquely, and the minimum inner diameter of the opening 1110 is formed to be larger than the horizontal area of the upper surface of the micro LED 100. The micro LED adsorbent 1000 is configured to be equipped with the above-mentioned mask 1400. When the micro LED 100 is vacuum-adsorbed, the micro LED 100 can be guided to the micro LED and the porous member 1100 can be vacuum-adsorbed. The vacuum suction position of the lower surface of the micro LED 100 can accurately vacuum-vacuate to the exact position.

圖10(a)至圖10(e)是繪示利用在多孔性部件1100的下部配備圖4的遮罩1400的本發明的實施例的微LED吸附體1000轉移微LED100的方法的圖。在圖10中繪示為配備圖4的遮罩1400,但可配備圖5至圖9的遮罩1400。FIGS. 10 (a) to 10 (e) are diagrams illustrating a method of transferring the micro LED 100 by using the micro LED adsorbent 1000 according to the embodiment of the present invention in which the mask 1400 of FIG. 4 is provided under the porous member 1100. In FIG. 10, the mask 1400 shown in FIG. 4 is provided, but the mask 1400 shown in FIGS. 5 to 9 may be provided.

如圖10(a)所示,施加在真空腔室1200的真空傳遞到多個氣孔而產生真空吸入力的多孔性部件1100以真空吸入力吸附遮罩1400。如圖10(b)所示,遮罩1400因真空吸入力吸附到多孔性部件1100而配備。如圖10(c)所示,使形成在生長基板101上的多個微LED100呈可從生長基板101分離的狀態。此後,在使微LED吸附體1000向生長基板101的上部移動而定位後,使微LED吸附體1000下降。微LED吸附體1000藉由真空埠形成真空壓,由此對多孔性部件1100施加真空而像圖10(d)所示一樣真空吸附微LED100。在微LED吸附體1000以真空力吸附微LED100時,可使微LED吸附體1000的多孔性部件1100與微LED100密接而進行真空吸附。此後,使微LED吸附體1000向顯示基板301的上部移動而定位後下降。此時,雖未圖示,但可解除藉由真空埠施加在多孔性部件1100的真空而將真空吸附在多孔性部件1100的下部的遮罩1400及微LED100傳遞到顯示基板301。此後,傳遞在顯示基板301的微LED100可藉由對顯示基板301施加電源而接合到顯示基板301的第一接觸電極106。此後,如圖10(e)所示,微LED吸附體1000藉由真空埠形成真空壓,由此可對多孔性部件1100施加真空而再次吸附傳遞在顯示基板301的遮罩1400。微LED100接合在第一接觸電極106,因此可僅將遮罩1400真空吸附到多孔性部件1100的下部。在本發明中,繪示為微LED吸附體1000再次吸附傳遞在顯示基板301的遮罩1400而去除,但可藉由其他適當的方法去除遮罩1400。As shown in FIG. 10 (a), the porous member 1100 that transmits the vacuum applied to the vacuum chamber 1200 to a plurality of air holes and generates a vacuum suction force absorbs the mask 1400 with the vacuum suction force. As shown in FIG. 10 (b), the mask 1400 is provided by being adsorbed to the porous member 1100 by a vacuum suction force. As shown in FIG. 10 (c), the plurality of micro LEDs 100 formed on the growth substrate 101 are brought into a state where they can be separated from the growth substrate 101. After that, after the micro LED adsorbent 1000 is moved to the upper portion of the growth substrate 101 to be positioned, the micro LED adsorbent 1000 is lowered. The micro LED adsorbent 1000 applies vacuum to the porous member 1100 by forming a vacuum pressure through the vacuum port, and vacuum adsorbs the micro LED 100 as shown in FIG. 10 (d). When the micro LED adsorbent 1000 adsorbs the micro LED 100 with a vacuum force, the porous member 1100 of the micro LED adsorbent 1000 can be brought into close contact with the micro LED 100 to perform vacuum adsorption. After that, the micro LED adsorbent 1000 is moved to the upper portion of the display substrate 301 to be positioned and lowered. At this time, although not shown in the figure, the mask 1400 and the micro LEDs 100 that adsorb the vacuum on the lower portion of the porous member 1100 and release the vacuum applied to the porous member 1100 through the vacuum port can be transferred to the display substrate 301. Thereafter, the micro LEDs 100 transmitted on the display substrate 301 may be bonded to the first contact electrode 106 of the display substrate 301 by applying power to the display substrate 301. Thereafter, as shown in FIG. 10 (e), the micro LED adsorbent 1000 is formed with a vacuum pressure by the vacuum port, so that a vacuum can be applied to the porous member 1100 and the mask 1400 transferred to the display substrate 301 can be adsorbed again. Since the micro LED 100 is bonded to the first contact electrode 106, only the mask 1400 can be vacuum-adsorbed to the lower portion of the porous member 1100. In the present invention, it is shown that the micro LED adsorbent 1000 once again removes the mask 1400 transferred to the display substrate 301, but the mask 1400 can be removed by other appropriate methods.

另外,雖未圖示,但像圖10(d)一樣真空吸附微LED100的微LED吸附體1000可向顯示基板301的上部移動而定位後下降。下降的微LED吸附體1000可在藉由真空吸附的微LED100的上表面按壓微LED100的狀態下,藉由遮罩1400對微LED100的上表面進行加熱而接合微LED100。在接合微LED100後,微LED吸附體1000可像圖10(e)一樣以在多孔性部件1100的下部真空吸附有遮罩1400的狀態上升而僅將微LED100傳遞到顯示基板301。In addition, although not shown, as shown in FIG. 10 (d), the micro LED adsorbent 1000 that vacuum-adsorbs the micro LED 100 can be moved to the upper portion of the display substrate 301 and positioned after descending. The lowered micro LED adsorbent 1000 can bond the micro LED 100 by heating the upper surface of the micro LED 100 with a mask 1400 in a state where the micro LED 100 is pressed by the upper surface of the micro LED 100 adsorbed by vacuum. After the micro LED 100 is bonded, the micro LED adsorber 1000 can be raised in a state where the mask 1400 is vacuum-adsorbed on the lower part of the porous member 1100 like FIG. 10 (e), and the micro LED 100 can be transferred to the display substrate 301 only.

如上所述,本發明的微LED吸附體1000配備遮罩1400而可藉由遮罩1400的開口部1110更大地形成真空吸附微LED100的真空壓,因較大的真空壓而微LED100直接與具有均勻的平坦度的多孔性部件1100的下部表面接觸,從而可防止在真空吸附時發生脫落。As described above, the micro-LED adsorbent 1000 of the present invention is provided with the cover 1400, and the vacuum pressure of the micro-LED 100 can be formed by the opening 1110 of the cover 1400. The micro-LED 100 directly and The lower surface of the porous member 1100 having a uniform flatness is in contact with each other, so that it can be prevented from falling off during vacuum adsorption.

如上所述,參照本發明的較佳實施例進行了說明,但本技術領域內的普通技術人員可在不脫離隨附的申請專利範圍中所記載的本發明的思想及領域的範圍內對本發明進行各種修正或變形而實施。As described above, the description has been made with reference to the preferred embodiments of the present invention, but a person of ordinary skill in the art can make the present invention without departing from the spirit and field of the present invention described in the scope of the attached patent application. Various corrections or deformations are performed.

100‧‧‧微LED100‧‧‧Micro LED

101‧‧‧生長基板 101‧‧‧Growth substrate

102‧‧‧第一半導體層 102‧‧‧First semiconductor layer

103、310‧‧‧活性層 103, 310‧‧‧ Active layer

104‧‧‧第二半導體層 104‧‧‧Second semiconductor layer

106‧‧‧第一接觸電極 106‧‧‧First contact electrode

107‧‧‧第二接觸電極 107‧‧‧Second contact electrode

301‧‧‧顯示基板 301‧‧‧display board

311‧‧‧緩衝層 311‧‧‧Buffer layer

313‧‧‧柵極絕緣膜 313‧‧‧Gate insulation film

315‧‧‧層間絕緣膜 315‧‧‧Interlayer insulation film

317‧‧‧平坦化層 317‧‧‧ flattening layer

320‧‧‧柵極電極 320‧‧‧ Gate electrode

330a‧‧‧源極電極 330a‧‧‧Source electrode

330b‧‧‧汲極電極 330b‧‧‧Drain electrode

400‧‧‧障壁層 400‧‧‧ barrier wall

410‧‧‧第一障壁層 410‧‧‧The first barrier layer

420‧‧‧第二障壁層 420‧‧‧Second barrier layer

510‧‧‧第一電極 510‧‧‧first electrode

520‧‧‧鈍化層 520‧‧‧ passivation layer

530‧‧‧第二電極 530‧‧‧Second electrode

550‧‧‧導電層 550‧‧‧ conductive layer

1000‧‧‧微LED吸附體 1000‧‧‧Micro LED adsorbent

1100‧‧‧多孔性部件 1100‧‧‧ porous parts

1110‧‧‧開口部 1110‧‧‧ opening

1130‧‧‧非吸附區域 1130‧‧‧ non-adsorption area

1200‧‧‧真空腔室 1200‧‧‧Vacuum chamber

1400‧‧‧遮罩 1400‧‧‧Mask

D‧‧‧直徑 D‧‧‧ diameter

P‧‧‧間距 P‧‧‧Pitch

S‧‧‧相隔距離 S‧‧‧ separated distance

W‧‧‧寬度 W‧‧‧Width

圖1是繪示成為本發明的實施例的傳送對象的微LED的圖。FIG. 1 is a diagram illustrating a micro LED that is a transmission target according to an embodiment of the present invention.

圖2是繪示藉由本發明的實施例傳送到顯示基板而安裝的微LED構造體的圖。 FIG. 2 is a diagram showing a micro LED structure mounted by being transferred to a display substrate according to an embodiment of the present invention.

圖3(a)是繪示根據本發明的較佳實施例的微LED吸附體吸附微LED前的狀態的圖。 FIG. 3 (a) is a diagram illustrating a state before a micro LED adsorbent adsorbs a micro LED according to a preferred embodiment of the present invention.

圖3(b)是繪示根據本發明的較佳實施例的微LED吸附體吸附微LED的狀態的圖。 FIG. 3 (b) is a diagram illustrating a state in which a micro LED adsorbent adsorbs a micro LED according to a preferred embodiment of the present invention.

圖4至圖7是繪示關於本發明的實施例的遮罩的實施例的圖。 4 to 7 are diagrams illustrating an embodiment of a mask according to an embodiment of the present invention.

圖8是繪示本發明的實施例的第一變形例的圖。 FIG. 8 is a diagram illustrating a first modified example of the embodiment of the present invention.

圖9是繪示本發明的實施例的第二變形例的圖。 FIG. 9 is a diagram illustrating a second modification of the embodiment of the present invention.

圖10是繪示利用根據本發明的實施例的微LED吸附體轉移微LED的方法的圖。 FIG. 10 is a diagram illustrating a method for transferring a micro LED using a micro LED adsorbent according to an embodiment of the present invention.

Claims (6)

一種微發光二極體吸附體,其特徵在於配備: 多孔性部件,具有氣孔;以及 遮罩,配備到所述多孔性部件的下部,具有開口部。A microluminescent diode adsorbent, which is characterized by being equipped with: Porous parts with pores; and The mask is provided to a lower portion of the porous member and has an opening portion. 如申請專利範圍第1項所述的微發光二極體吸附體,其特徵在於, 所述遮罩為鎳鋼材質。The microluminescent diode adsorbent according to item 1 of the scope of patent application, characterized in that: The mask is made of nickel steel. 如申請專利範圍第1項所述的微發光二極體吸附體,其特徵在於, 所述遮罩為金屬材質。The microluminescent diode adsorbent according to item 1 of the scope of patent application, characterized in that: The mask is made of metal. 如申請專利範圍第1項所述的微發光二極體吸附體,其特徵在於, 所述遮罩為膜材質。The microluminescent diode adsorbent according to item 1 of the scope of patent application, characterized in that: The mask is made of a film material. 如申請專利範圍第1項所述的微發光二極體吸附體,其特徵在於, 所述遮罩為紙材質。The microluminescent diode adsorbent according to item 1 of the scope of patent application, characterized in that: The mask is made of paper. 如申請專利範圍第1項所述的微發光二極體吸附體,其特徵在於, 所述遮罩藉由所述多孔性部件的真空吸入力吸附到所述多孔性部件而配備。The microluminescent diode adsorbent according to item 1 of the scope of patent application, characterized in that: The mask is provided by being adsorbed to the porous member by a vacuum suction force of the porous member.
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