TW201936949A - A substrate support for supporting a substrate having a front surface to be processed and an opposing back surface, a method for processing a substrate, a vacuum processing apparatus and a substrate processing system - Google Patents

A substrate support for supporting a substrate having a front surface to be processed and an opposing back surface, a method for processing a substrate, a vacuum processing apparatus and a substrate processing system Download PDF

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TW201936949A
TW201936949A TW107139304A TW107139304A TW201936949A TW 201936949 A TW201936949 A TW 201936949A TW 107139304 A TW107139304 A TW 107139304A TW 107139304 A TW107139304 A TW 107139304A TW 201936949 A TW201936949 A TW 201936949A
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substrate
support
dry adhesive
support body
substrate support
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TW107139304A
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Chinese (zh)
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賽門 勞
安格 海幕奇
萊納 亨特史豪特
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美商應用材料股份有限公司
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Publication of TW201936949A publication Critical patent/TW201936949A/en

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32431Constructional details of the reactor
    • H01J37/32715Workpiece holder
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/04Coating on selected surface areas, e.g. using masks
    • C23C14/042Coating on selected surface areas, e.g. using masks using masks
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/50Substrate holders
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/04Coating on selected surface areas, e.g. using masks
    • C23C16/042Coating on selected surface areas, e.g. using masks using masks
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/458Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
    • C23C16/4581Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber characterised by material of construction or surface finish of the means for supporting the substrate
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32431Constructional details of the reactor
    • H01J37/32733Means for moving the material to be treated
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32431Constructional details of the reactor
    • H01J37/32798Further details of plasma apparatus not provided for in groups H01J37/3244 - H01J37/32788; special provisions for cleaning or maintenance of the apparatus
    • H01J37/32899Multiple chambers, e.g. cluster tools
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/687Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
    • H01L21/68714Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
    • H01L21/6875Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a plurality of individual support members, e.g. support posts or protrusions
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/687Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
    • H01L21/68714Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
    • H01L21/68764Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a movable susceptor, stage or support, others than those only rotating on their own vertical axis, e.g. susceptors on a rotating caroussel

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Mechanical Engineering (AREA)
  • Organic Chemistry (AREA)
  • Metallurgy (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Materials Engineering (AREA)
  • Analytical Chemistry (AREA)
  • Plasma & Fusion (AREA)
  • General Chemical & Material Sciences (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Physical Vapour Deposition (AREA)

Abstract

A substrate support for supporting a substrate having a front surface to be processed and an opposing back surface is described. The substrate support includes a support body and a dry adhesive assembly attached to the support body, the dry adhesive assembly having one or more dry adhesive elements, wherein the one or more dry adhesive elements support the substrate at the back surface in at least a center region and an outer region.

Description

用以支撐具有待處理之前側表面和相對之背側表面的一基板的基板支撐件、用以處理一基板的方法、真空處理設備及真空處理系統Substrate support for supporting a substrate having a front side surface to be treated and an opposite back side surface, a method for processing a substrate, a vacuum processing apparatus, and a vacuum processing system

實施例係有關於用以真空處理的一基板支撐件。本揭露的實施例係特別地有關於用以處理一基板的一基板支撐件與一支撐主體和附接至支撐主體的乾燥黏著元件、包括一真空腔室的一真空處理系統、真空腔室中的一基板支撐件與一處理站及一基板處理系統。本揭露的實施例係更有關於包括固持一基板於一非垂直位置之用以處理一基板的一方法。Embodiments relate to a substrate support for vacuum processing. Embodiments of the present disclosure are particularly directed to a substrate support for processing a substrate and a support body and a dry adhesive member attached to the support body, a vacuum processing system including a vacuum chamber, and a vacuum chamber A substrate support member and a processing station and a substrate processing system. Embodiments of the present disclosure are more related to a method for processing a substrate by holding a substrate in a non-vertical position.

在基板上沉積層的已知技術包括(例如是)熱蒸發(thermal evaporation)、化學氣相(chemical vapor)、化學氣相沉積(Chemical Vapor Deposition, CVD)及物理氣相沉積(Physical Vapor Deposition, PVD)(例如是濺鍍沉積)。濺鍍沉積製程可用於沉積一材料層(例如是絕緣材料層)於基板上。在濺鍍沉積製程的期間,具有欲沉積於基板上的靶材材料的靶材是受到產生於電漿區中的離子撞擊(bombard),以將靶材材料的原子由靶材表面移動(dislodge)。移動的原子可在基板上形成材料層。在活性濺鍍沉積製程中,移動的原子可與電漿區中的氣體(例如是氮氣或氧氣)反應,以在基板上形成靶材材料之氧化物、氮化物、或氮氧化物。Known techniques for depositing layers on a substrate include, for example, thermal evaporation, chemical vapor, chemical vapor deposition (CVD), and physical vapor deposition (Physical Vapor Deposition). PVD) (for example, sputter deposition). A sputter deposition process can be used to deposit a layer of material, such as a layer of insulating material, onto the substrate. During the sputter deposition process, the target having the target material to be deposited on the substrate is bombarded by ions generated in the plasma region to move the atoms of the target material from the surface of the target (dislodge) ). The moving atoms can form a layer of material on the substrate. In an active sputter deposition process, moving atoms can react with gases in the plasma zone, such as nitrogen or oxygen, to form oxides, nitrides, or oxynitrides of the target material on the substrate.

被塗佈的材料可用於一些應用及一些技術領域中。例如,被塗佈的材料可用於微電子領域中,例如是用於製造半導體裝置。同樣地,顯示用基板可使用物理氣相沉積製程進行塗佈。又,應用包括絕緣面板、有機發光二極體(OLED)面板、具有薄膜電晶體、彩色濾光片或類似物的基板。The coated material can be used in some applications and in some technical fields. For example, the coated material can be used in the field of microelectronics, for example, in the fabrication of semiconductor devices. Similarly, the substrate for display can be coated using a physical vapor deposition process. Also, applications include an insulating panel, an organic light emitting diode (OLED) panel, a substrate having a thin film transistor, a color filter, or the like.

在當前的發展中,例如在移動裝置和電視屏幕或類似物的領域中,高分辨率顯示器(high resolution displays)是有益的。在目前具有高分辨率的移動裝置與大型4k / 8k電視機(TV-sets)等的發展中,非常低水平的粒子到達基板是有益的,例如在PVD處理期間。由於成本和效率的原因,工業傾向於處理越來越大的基板。大型基板,特別是大型玻璃盤(large glass disks)在加工過程中係難以處理。在處理操作之前,基板在運輸或對準期間特別容易受到表面的損壞,破損或劃傷。在基板處理期間,提供夾具以將基板固持在基板的邊緣上。玻璃固定係夾持於玻璃邊緣。使用夾具固持基板導致由於玻璃遮罩對準(陰影效應)導致的微粒雜質和均勻性問題,增加的玻璃遮罩間隙影響微粒雜質水平和層均勻性,並最終在夾具上進行側面沉積。In current developments, such as in the field of mobile devices and television screens or the like, high resolution displays are beneficial. In the current development of high resolution mobile devices and large 4k / 8k televisions (TV-sets), it is beneficial for very low levels of particles to reach the substrate, for example during PVD processing. Due to cost and efficiency, the industry tends to handle larger and larger substrates. Large substrates, especially large glass disks, are difficult to handle during processing. Prior to handling operations, the substrate is particularly susceptible to surface damage, breakage or scratching during shipping or alignment. During substrate processing, a jig is provided to hold the substrate on the edge of the substrate. The glass fixing system is clamped to the edge of the glass. Holding the substrate with a clamp results in particulate impurities and uniformity problems due to glass mask alignment (shadow effect), the increased glass mask gap affects particle impurity levels and layer uniformity, and ultimately lateral deposition on the fixture.

鑒於上述,提供一種用以支撐基板的基板支撐件、一種真空處理設備、多個用以處理一基板的方法、及一種真空處理系統。In view of the above, a substrate support for supporting a substrate, a vacuum processing apparatus, a plurality of methods for processing a substrate, and a vacuum processing system are provided.

根據一實施例中,提供一種基板支撐件,用以支撐具有待處理之一前側表面和相對之一背側表面的一基板,基板支撐件包括一支撐主體和附接至支撐主體的一乾燥黏著組件,乾燥黏著組件具有一或多個乾燥黏著元件,其中一或多個乾燥黏著元件於背側表面的至少一中心區域和一外部區域支撐基板。According to an embodiment, a substrate support is provided for supporting a substrate having a front side surface to be treated and a back side surface, the substrate support comprising a support body and a dry adhesive attached to the support body The assembly, dry adhesive assembly has one or more dry adhesive elements, wherein one or more dry adhesive elements support the substrate in at least a central region and an outer region of the backside surface.

根據另一實施例中,提供一種用以處理一基板的方法,方法包括固持基板於一非垂直位置,基板的一背側表面係附接至多個乾燥黏著元件及基板的一前側表面係面向下於一處理站上方。According to another embodiment, a method for processing a substrate is provided, the method comprising: holding a substrate in a non-vertical position, a back side surface of the substrate being attached to the plurality of dry adhesive members, and a front side surface of the substrate facing downward Above a processing station.

根據另一實施例中,提供一種用以處理一基板的方法,方法包括使用多個乾燥黏著元件附接基板的一背側表面於一支撐主體上,待處理之基板的一前側表面係面向上,並將支撐主體上下反轉以使待處理之基板的一前側表面面向下。According to another embodiment, a method for processing a substrate is provided, the method comprising attaching a back side surface of the substrate to a support body using a plurality of dry adhesive elements, a front side surface of the substrate to be processed facing upward And the support body is inverted upside down so that a front side surface of the substrate to be processed faces downward.

根據另一實施例中,提供一種真空處理設備,真空處理設備包括一基板支撐件,具有一支撐主體和一乾燥黏著配置,乾燥黏著配置位於支撐主體上且具有一或多個乾燥黏著元件,一或多個乾燥黏著元件設置以於背側表面的至少一中心區域和一外部區域支撐基板,以及一處理站,至少部分低於基板支撐件。According to another embodiment, a vacuum processing apparatus is provided, the vacuum processing apparatus comprising a substrate support having a support body and a dry adhesive arrangement, the dry adhesive arrangement being located on the support body and having one or more dry adhesive elements, Or a plurality of dry adhesive elements are disposed to support the substrate at least a central region and an outer region of the backside surface, and a processing station at least partially below the substrate support.

根據另一實施例中,提供一種基板處理系統,基板處理系統包括一負載模組、一真空傳送腔室及一真空處理設備。In accordance with another embodiment, a substrate processing system is provided that includes a load module, a vacuum transfer chamber, and a vacuum processing device.

現將詳細描述各種實施例,其一個或多個範例係繪示於圖式中。在以下對於圖式的敘述中,相同的元件符號意指相同的元件。一般而言,僅針對個別的實施例的不同處作描述。各個範例的提供係作為解釋的一種手段,並不代表作為限制。此外,所描繪或敘述為一個實施例之一部分的特徵,可使用在其它實施例、或與其它實施例一同使用,以產生又一個實施例。本說明書中意欲包括此類的修飾與變形。Various embodiments will now be described in detail, one or more examples of which are illustrated in the drawings. In the following description of the drawings, the same element symbols mean the same elements. In general, only the differences of the individual embodiments are described. The provision of each example is provided as a means of explanation and is not meant as a limitation. Furthermore, features illustrated or described as part of one embodiment can be used in other embodiments or in conjunction with other embodiments to yield a further embodiment. Modifications and variations of the invention are intended to be included in the description.

在以下對於圖式的敘述中,相同的元件符號意指相同或相似的元件。一般而言,僅針對個別的實施例的不同處作描述。除非另有說明,否則一部分或方面的描述也適用於另一個實施例中的對應部分或方面。In the following description of the drawings, the same element symbols mean the same or similar elements. In general, only the differences of the individual embodiments are described. The description of a part or aspect applies to a corresponding part or aspect in another embodiment unless otherwise stated.

根據本揭露的實施例中,提供一種基板支撐件,用以支撐具有待處理之一前側表面和相對之一背側表面的一基板,基板支撐件包括一支撐主體和附接至支撐主體的一乾燥黏著組件,乾燥黏著組件具有一或多個乾燥黏著元件,其中一或多個乾燥黏著元件於背側表面的至少一中心區域和一外部區域支撐基板。According to an embodiment of the present disclosure, a substrate support is provided for supporting a substrate having a front side surface and a back side surface to be processed, the substrate support including a support body and a attached to the support body The dry adhesive assembly has one or more dry adhesive elements, wherein the one or more dry adhesive elements support the substrate in at least a central region and an outer region of the backside surface.

具有乾燥黏著劑的一基板支撐件,例如一壁虎黏著劑(gecko adhesive),能夠以非垂直基板方向進行基板處理,特別是基板面向下,亦即基板至少部分地設置低於基板載體。乾燥黏著組件不僅能夠固持玻璃邊緣(例如使用一夾具系統),還可以額外固持基板(例如玻璃)的一中心區域或中間區域。A substrate support having a dry adhesive, such as a gecko adhesive, can perform substrate processing in a non-vertical substrate orientation, particularly with the substrate facing down, i.e., the substrate is at least partially disposed below the substrate carrier. The dry adhesive assembly not only holds the glass edge (eg, using a fixture system), but also additionally holds a central or intermediate region of the substrate (eg, glass).

鑒於上述,根據實施例的另一方面,提供一種真空處理設備。真空處理設備包括一基板支撐件,該基板支撐件具有一支撐主體和一乾燥黏著配置。乾燥黏著配置位於支撐主體上且具有一或多個乾燥黏著元件。於處理站中一或多個乾燥黏著元件設置以於背側表面的至少一中心區域和一外部區域支撐基板。設備可包括一處理站,至少部分低於基板支撐件。In view of the above, according to another aspect of an embodiment, a vacuum processing apparatus is provided. The vacuum processing apparatus includes a substrate support having a support body and a dry adhesive configuration. The dry adhesive configuration is located on the support body and has one or more dry adhesive elements. One or more dry adhesive elements are disposed in the processing station to support the substrate at least a central region and an outer region of the backside surface. The apparatus can include a processing station that is at least partially lower than the substrate support.

於本揭露中,提供一種基板支撐件,用以支撐具有待處理之一前側表面和相對之一背側表面的一基板,基板支撐件包括一支撐主體和附接至支撐主體的一乾燥黏著組件,乾燥黏著組件具有一或多個乾燥黏著元件,其中一或多個乾燥黏著元件於背側表面的至少一中心區域和一外部區域支撐基板。In the present disclosure, a substrate support member is provided for supporting a substrate having a front side surface and a back side surface to be processed, the substrate support comprising a support body and a dry adhesive component attached to the support body The dry adhesive assembly has one or more dry adhesive elements, wherein the one or more dry adhesive elements support the substrate in at least a central region and an outer region of the backside surface.

根據一些實施例,「基板支撐件」可理解為設置以固持基板,特別是如本文所述的大面積基板。典型地,「基板支撐件(substrate support)」、「載體(carrier)」與「支撐件(support)」等詞語可同義使用。如本文所述由基板支撐件固持或支撐的基板包括前側表面和後側表面,其中前側表面係為待處理的基板的表面。舉例而言,前側表面係為要沉積材料層於其上的表面。典型地,基板支撐件設置以使基板的背側表面可附接至載體,特別是本文所述之基板支撐件的一乾燥黏著劑。According to some embodiments, a "substrate support" is understood to be arranged to hold a substrate, particularly a large area substrate as described herein. Typically, the terms "substrate support", "carrier" and "support" are used synonymously. The substrate held or supported by the substrate support as described herein includes a front side surface and a back side surface, wherein the front side surface is the surface of the substrate to be processed. For example, the front side surface is the surface on which the layer of material is to be deposited. Typically, the substrate support is arranged such that the backside surface of the substrate can be attached to a carrier, particularly a dry adhesive of the substrate support described herein.

本文使用的用語「基板」可包括非撓性(inflexible)的基板,例如玻璃板、金屬板、晶圓、透明結晶的切片、玻璃基板或陶瓷板。然而,本揭露不限於此,用語「基板」也可包含撓性基板,例如卷(web)或箔(foil),例如金屬箔(metal foil)或塑膠箔(plastic foil)。根據可結合本文所述任何其他實施例的一些實施例,基板可由任何適用於材料沈積的材料組成。舉例而言,基板可由一種材料構成,其選自由玻璃(例如鹼石灰玻璃、硼矽酸鹽玻璃等)、金屬、聚合物、陶瓷、複合材料、碳纖維材料、雲母、或可藉由沈積製程來塗佈的任何其他材料或材料組合所組成的群組。舉例而言,於垂直於基板的主要表面的一方向上基板可具有0.1毫米至1.8毫米的厚度,例如0.7毫米、0.5毫米或0.3毫米。一些實施方式之中,基板的厚度為50微米或更大且/或700微米或更小。The term "substrate" as used herein may include an inflexible substrate such as a glass plate, a metal plate, a wafer, a transparent crystalline slice, a glass substrate, or a ceramic plate. However, the present disclosure is not limited thereto, and the term "substrate" may also include a flexible substrate such as a web or a foil such as a metal foil or a plastic foil. According to some embodiments, which may be combined with any of the other embodiments described herein, the substrate may be comprised of any material suitable for deposition of materials. For example, the substrate may be composed of a material selected from the group consisting of glass (eg, soda lime glass, borosilicate glass, etc.), metal, polymer, ceramic, composite, carbon fiber material, mica, or may be deposited by a deposition process. A group of any other material or combination of materials coated. For example, the one-sided substrate perpendicular to the major surface of the substrate may have a thickness of 0.1 mm to 1.8 mm, such as 0.7 mm, 0.5 mm, or 0.3 mm. In some embodiments, the thickness of the substrate is 50 microns or greater and/or 700 microns or less.

根據可結合本文所述任何其他實施例的一些實施例,基板可以是大面積基板。大面積基板可具有0.5m²或更大的表面積。典型地,大面積基板被用於顯示器製造且可以是玻璃板或塑膠板。舉例而言,本文所述的基板應包括用於液晶顯示器(LCD)、電漿顯示面板(PDP)及類似物的基板。舉例來說,大面積基板可具有1m²或更大的面積的主要表面。某些實施例之中,大面積基板可以是對應於0.67m²(0.73x0.92m)面積的第4.5代基板、對應於1.4m²(1.1m x 1.3m)面積的第5代基板。大面積基板更可以是對應於4.29m²(1.95m x 2.2m)面積的第7.5代基板、對應於5.7m²(2.2m x 2.5m)面積的第8.5代基板、或甚至是對應於8.7m²(2.85m ×3.05 m)面積的第10代基板。甚至可類似地實施於更高世代(例如第11代與第12代基板)與對應的基板面積。According to some embodiments, which may be combined with any of the other embodiments described herein, the substrate may be a large area substrate. The large area substrate may have a surface area of 0.5 m 2 or more. Typically, large area substrates are used in display fabrication and can be glass or plastic sheets. For example, the substrates described herein should include substrates for liquid crystal displays (LCDs), plasma display panels (PDPs), and the like. For example, a large area substrate may have a major surface with an area of 1 m 2 or more. In some embodiments, the large-area substrate may be a 4.5th generation substrate corresponding to an area of 0.67 m 2 (0.73 x 0.92 m), and a 5th generation substrate corresponding to an area of 1.4 m 2 (1.1 m x 1.3 m). The large-area substrate may be a 7.5th generation substrate corresponding to an area of 4.29 m 2 (1.95 mx 2.2 m), an 8.5th generation substrate corresponding to an area of 5.7 m 2 (2.2 mx 2.5 m), or even corresponding to 8.7 m 2 (2.85 m). ×105 m) The 10th generation substrate of the area. It can even be similarly implemented in higher generations (eg, 11th and 12th generation substrates) and corresponding substrate areas.

如第1圖所繪示根據本文所述之一示例性矩形基板支撐件的俯視示意圖。基板支撐件100包括具有乾燥黏著元件的一乾燥黏著組件105。乾燥黏著組件105是由中心固持件120和外部固持件130所形成。中心固持件120係配置於基板支撐件100的中心145上或附近。外部固持件130係配置於外部區域,特別是基板支撐件100的角落邊緣118。外部固持件130可在外部固持件130與基板支撐件100的外部邊緣116之間形成一間隙區114於基板支撐件100的表面110上。A top plan view of an exemplary rectangular substrate support in accordance with one of the Figures is illustrated in FIG. The substrate support 100 includes a dry adhesive assembly 105 having dry adhesive elements. The dry adhesive assembly 105 is formed by the center holder 120 and the outer holder 130. The center holder 120 is disposed on or near the center 145 of the substrate support 100. The outer holder 130 is disposed in an outer region, particularly a corner edge 118 of the substrate support 100. The outer holder 130 can form a gap region 114 on the surface 110 of the substrate support 100 between the outer holder 130 and the outer edge 116 of the substrate support 100.

如第1至3圖所示,基板支撐件可由全區乾燥黏著劑(full area dry adhesive)提供,例如全區壁虎吸盤(full area gecko chuck),或較小的乾燥黏著元件的圖案。例如一壁虎吸盤的一乾燥黏著配置可具有一圖案(pattern)或任何其他網格乾燥黏著元件(grid dry adhesive elements)。這使得懸掛有一基板(例如玻璃)之處理或塗覆區以主動側(即前側表面)面向下。產生之微粒雜質將跟隨重力並從前側表面(即活性玻璃側)下落。此外,使用例如壁虎材料(gecko material)的乾燥黏著劑,以避免玻璃夾持而產生的微粒雜質。As shown in Figures 1 through 3, the substrate support can be provided by a full area dry adhesive, such as a full area gecko chuck, or a pattern of smaller dry adhesive elements. For example, a dry adhesive configuration of a gecko suction cup can have a pattern or any other grid dry adhesive elements. This allows the treatment or coating zone that hangs a substrate (e.g., glass) to face down with the active side (i.e., the front side surface). The resulting particulate impurities will follow gravity and fall from the front side surface (ie, the active glass side). Further, a dry adhesive such as a gecko material is used to avoid particulate impurities generated by glass clamping.

於第2圖中示出基板支撐件100的另一示例性實施例;乾燥黏著組件105係示出包括兩個外部固持件130,並設置於基板支撐件100的表面110上之兩個相對側。外部固持件130可以採用條狀設計(strip-like design)。Another exemplary embodiment of the substrate support 100 is shown in FIG. 2; the dry adhesive assembly 105 is shown to include two outer holders 130 and disposed on opposite sides of the surface 110 of the substrate support 100 . The outer holder 130 may have a strip-like design.

參照第3圖,示出基板支撐件100之另一示例性實施例的俯視圖;乾燥黏著組件105係示出在外部區域具有環狀設計(ring-like design)之一外部固持件130以及在其附近或大約中心點附近或中心145之一中心固持件120。例如,外部固持件可圍繞或部分地圍繞中心固持件。Referring to FIG. 3, a top view of another exemplary embodiment of the substrate support 100 is shown; the dry adhesive assembly 105 shows one of the outer holders 130 having a ring-like design in the outer region and The center holder 120 is near or near a center point or a center 145. For example, the outer retainer can surround or partially surround the center retainer.

根據可與其他所述實施例結合的一些實施例,支撐主體可理解為一配置,設置以固持一基板。舉例而言,支撐主體可以是剛性體,例如框架(frame)或板(plate)。特別是,支撐主體可設置以支撐基板的表面,例如基板的背側表面。支撐主體可具有多邊形設計(polygon shaped design),其形成一平坦表面,特別是一均勻的平坦表面,以支撐基板的背側表面。舉例而言,支撐主體可具有矩形或方形設計。與被支撐的基板相比,支撐主體的周長可以具有實質上相同的周長。According to some embodiments, which can be combined with other described embodiments, the support body can be understood as a configuration that is configured to hold a substrate. For example, the support body can be a rigid body, such as a frame or a plate. In particular, the support body can be configured to support a surface of the substrate, such as a back side surface of the substrate. The support body can have a polygonal shaped design that forms a flat surface, particularly a uniform flat surface, to support the backside surface of the substrate. For example, the support body can have a rectangular or square design. The perimeter of the support body can have substantially the same perimeter as compared to the supported substrate.

乾燥黏著元件可包括多個乾燥黏著結構。乾燥黏著結構可包括從表面突出的第一黏著結構,其中第一黏著結構具有平行於表面的一各向異性柔性(anisotropic flexibility)。舉例而言,多個黏著結構可具有平行於表面的一各向異性柔性。乾燥黏著結構可具有從表面突出的第二幹黏著結構。當用相同的力在相同方向上彎曲時,第一黏著結構不同地彎曲。The dry adhesive element can comprise a plurality of dry adhesive structures. The dry adhesive structure can include a first adhesive structure that protrudes from the surface, wherein the first adhesive structure has an anisotropic flexibility parallel to the surface. For example, a plurality of adhesive structures can have an anisotropic flexibility parallel to the surface. The dry adhesive structure can have a second dry adhesive structure that protrudes from the surface. When bent in the same direction with the same force, the first adhesive structure is bent differently.

根據一些實施例,在中心區域的背側表面處支撐基板可理解為使得基板被支撐於鄰近基板中心點的一區。中心點可以是基板的背側表面的幾何中心。舉例而言,當支撐具有矩形或正方形形狀的基板時,中心點可以是基板的背側表面的兩個對角線的交叉點。在中心區域或鄰近中心區域支撐基板可有利於防止由於基板的自重而導致的基板彎曲(bending)或變形(deforming)。According to some embodiments, supporting the substrate at the backside surface of the central region is understood to be such that the substrate is supported in a region adjacent the center point of the substrate. The center point can be the geometric center of the back side surface of the substrate. For example, when supporting a substrate having a rectangular or square shape, the center point may be the intersection of two diagonal lines of the back side surface of the substrate. Supporting the substrate in the central region or adjacent to the central region may be advantageous to prevent substrate bending or deformation due to the self weight of the substrate.

根據實施例,支撐基板於外部區域可理解為使得基板被支撐於基板的邊緣區。基板的外部區域可為鄰近於或沿著基板的周圍的區域。支撐基板於外部區域也可理解為使得基板被支撐於相較於到基板的中心更靠近基板的邊緣之區域。According to an embodiment, the support substrate in the outer region can be understood such that the substrate is supported on the edge region of the substrate. The outer region of the substrate can be an area adjacent to or along the circumference of the substrate. The support substrate is also understood in the outer region such that the substrate is supported in a region closer to the edge of the substrate than to the center of the substrate.

根據可與其他所述實施例結合的一些實施例,基板支撐件係設置以固持一基板於一非垂直位置,其中基板的背側表面係附接至乾燥黏著元件以及基板的前側表面係面向下。基板可懸掛在基板支撐件下方。特別是當提及基板定向(substrate orientation)時,非垂直位置(non-vertical position)可理解為允許偏離+/- 20°或更低的水平方向或定向,例如是 +/- 10°以下。基板的水平位置的偏離可有利於促進基板的傳輸和/或對準。According to some embodiments, which may be combined with other embodiments, the substrate support is configured to hold a substrate in a non-vertical position, wherein the backside surface of the substrate is attached to the dry adhesive component and the front side surface of the substrate is facing down . The substrate can be suspended below the substrate support. Particularly when referring to a substrate orientation, a non-vertical position can be understood as allowing a horizontal direction or orientation that deviates by +/- 20 or less, for example +/- 10 or less. Deviation of the horizontal position of the substrate can facilitate facilitating transmission and/or alignment of the substrate.

於本揭露中,乾燥黏合配置(dry adhesive arrangement)應理解為一固持配置,設置以提供用於附著文中所述基板的一黏著力。特別是,乾燥黏合配置可設置於或附著於支撐主體上,使得文中所述基板可以透過乾燥黏合配置由支撐主體固持。更具體而言,文中所述之乾燥黏合配置可包括如文中所述之乾燥黏著元件(dry adhesive element)。乾燥黏著元件可設置以藉由凡得瓦力(van der Waals force)提供黏著力。乾燥黏合配置係設置以於基板表面和基板支撐件之間形成連結。基板和乾燥黏合配置之間的連結可以是耐滑的(slip resistant)、防滑的(nonskid)或類似物。有利地是,基板和乾燥黏合配置之間的連結可以是無殘留分離的(residue-free disconnected),例如在基板處理之後,特別是在沉積工藝之後。In the present disclosure, a dry adhesive arrangement is understood to be a holding configuration that is provided to provide an adhesion for attaching the substrate to the text. In particular, the dry adhesive configuration can be disposed on or attached to the support body such that the substrate described herein can be held by the support body through a dry adhesive configuration. More specifically, the dry adhesive configuration described herein can include a dry adhesive element as described herein. The dry adhesive element can be configured to provide adhesion by van der Waals force. The dry bonding arrangement is configured to form a bond between the substrate surface and the substrate support. The bond between the substrate and the dry adhesive configuration can be slip resistant, nonskid or the like. Advantageously, the bond between the substrate and the dry bond configuration can be residue-free disconnected, such as after substrate processing, particularly after the deposition process.

根據一些實施例,乾燥黏著元件可以是合成剛毛材料(synthetic setae material)。特別是合成剛毛材料之乾燥黏著劑的黏著能力可以是100%無機的。根據一些實施例,乾燥黏著元件可以是實質上100%無機的。According to some embodiments, the dry adhesive element may be a synthetic setae material. In particular, the adhesion of dry adhesives to synthetic bristle materials can be 100% inorganic. According to some embodiments, the dry adhesive element may be substantially 100% inorganic.

根據可與其他所述實施例結合的一些實施例,藉由乾燥黏著組件所提供的黏著力可以用以固持或攜帶文中所述的基板。尤其,乾燥黏著組件可設置以提供大約2 N/cm2 或更多的一黏著力,特別是3 N/cm2 或更多、更特別是4 N/cm2 或更多,例如至少5 N/cm2 或更多。According to some embodiments, which may be combined with other described embodiments, the adhesion provided by the dry adhesive assembly can be used to hold or carry the substrate described herein. In particular, the dry adhesive assembly can be arranged to provide an adhesion of about 2 N/cm 2 or more, in particular 3 N/cm 2 or more, more particularly 4 N/cm 2 or more, for example at least 5 N /cm 2 or more.

根據可與其他所述實施例結合的一些實施例,乾燥黏著組件係設置以形成一或多個固持件於支撐主體上。固持件可理解為在基板支撐件的表面上的一封閉的或獨有的區域(an enclosed or self-contained area),包括用於附接至基板的後側表面的乾燥黏著元件。固持件可於支撐主體上形成乾燥黏著元件的多個圖型。According to some embodiments, which may be combined with other described embodiments, the dry adhesive assembly is configured to form one or more retaining members on the support body. A holder is understood to be an enclosed or self-contained area on the surface of the substrate support, including a dry adhesive element for attachment to the back side surface of the substrate. The holder can form a plurality of patterns of dry adhesive elements on the support body.

參照第4圖,示出包括四個可動固持件225a、225b、225c、225d之一示例性實施例之一基板支撐件的俯視示意圖。四個固持件225可具有實質上相同的尺寸,並且設置在基板支撐件100的中心區域和外部區域。固持件係設置成可移動於徑向向外方向(radially outwards direction)255上,特別是面向基板支撐件100的邊緣,更特別是面向基板支撐件100的角落邊緣(corner edges)265。 固持件225可藉由心軸(mandrel)235或類似物而移動。尤其,心軸235可沿著由虛線描繪的徑向路徑(radial path)245向外按壓固持件。Referring to Fig. 4, a top plan view of a substrate support including one of the four exemplary embodiments of the four movable holders 225a, 225b, 225c, 225d is shown. The four holders 225 may have substantially the same size and are disposed at a central area and an outer area of the substrate support 100. The holders are arranged to be movable in a radially outwards direction 255, in particular towards the edge of the substrate support 100, more particularly toward the corner edges 265 of the substrate support 100. The holder 225 can be moved by a mandrel 235 or the like. In particular, the mandrel 235 can press the holder outwardly along a radial path 245 depicted by a dashed line.

根據文中所述的一些實施例,移動固持件或乾燥黏著元件用以從基板支撐件釋放基板。特別是,兩個或更多個乾燥黏著元件的運動對基板部件提供拉力,可有利於基板釋放。舉例而言,運動可使得第一乾燥黏著元件或固持件相對於基板表面移動,第二乾燥黏著元件或固持件相對於基板表面移動,並且相應的力抵互相抵消,用以提供一穩定或實質上穩定的基板位置。According to some embodiments described herein, a mobile holder or dry adhesive element is used to release the substrate from the substrate support. In particular, the movement of the two or more dry adhesive elements provides tension to the substrate components which may facilitate substrate release. For example, the movement may cause the first dry adhesive element or the holder to move relative to the surface of the substrate, the second dry adhesive element or the holder move relative to the surface of the substrate, and the corresponding forces cancel each other out to provide a stable or substantial Stable substrate position.

參照第5圖,示出一示例性實施例之包括四個可動中心固持件335a、335b、335c、335d和四個可動外部固持件345a、345b、345c、345d之一基板支撐件的俯視示意圖。中心固持件設置成可移動於徑向向外方向(radially outwards direction)上。外部固持件係設置成可移動於徑向向外方向(radially outwards direction)和/或徑向向內方向(radially inwards direction)上。Referring to Fig. 5, a top plan view of a substrate support including one of the four movable center holders 335a, 335b, 335c, 335d and the four movable outer holders 345a, 345b, 345c, 345d is shown in an exemplary embodiment. The central holder is configured to be movable in a radially outwards direction. The outer retainer is configured to be movable in a radially outwards direction and/or a radially inward direction.

根據可與本文所述的其他實施例組合的實施例,一個或多個固持件可移動地設置於支撐主體上。詞語「可移動地」可理解為固持件係設置以沿著支撐主體的表面移動或被移動。沿著支撐主體的表面之固持件的移動例如可沿著形成於基板支撐件表面上的通道或凹槽而運行,用以設定基板支撐件上的固持件的移動方向。固持件可設置以具有第一狀態,其中固持件可移動或可被移動,以及具有第二狀態,其中固持件可限定在支撐主體上的待固定之支撐主體。尤其,固持件可設置以相對於基板支撐件的中心點徑向向外地(radially outwards)和徑向向內地(radially inwards)移動。固持件也可設置以可沿著圍繞基板支撐件的中心點的圓形線移動。According to embodiments that can be combined with other embodiments described herein, one or more holders are movably disposed on the support body. The phrase "movably" is understood to mean that the retaining member is configured to move or be moved along the surface of the support body. Movement of the holder along the surface of the support body can be performed, for example, along a channel or groove formed on the surface of the substrate support for setting the direction of movement of the holder on the substrate support. The holder may be configured to have a first state, wherein the holder is movable or movable, and has a second state, wherein the holder may define a support body to be fixed on the support body. In particular, the holder can be arranged to move radially outwards and radially inwards relative to the center point of the substrate support. The holder may also be arranged to move along a circular line around the center point of the substrate support.

詞語「可移動地」也可理解為固持件設置以可伸展地和/或可縮回地配置於支撐主體上。伸展和/或縮回固持件例如可突出於支撐主體的支撐表面的一些延伸部分,以利於基板於固持件上的附接過程及分離過程,特別是係於基板支撐件上。具有可移動地配置於基板支撐件上的固持件可有利於將基板從支撐主體分離,特別是用於從基板的背側表面分離乾燥黏著元件。The phrase "movably" is also understood to mean that the holder is arranged to be stretchably and/or retractably arranged on the support body. The extension and/or retraction retainer may, for example, protrude from some extension of the support surface of the support body to facilitate attachment and separation of the substrate onto the holder, particularly to the substrate support. Having a holder movably disposed on the substrate support can facilitate separation of the substrate from the support body, particularly for separating dry adhesive elements from the backside surface of the substrate.

根據可與其他所述實施例結合的一些實施例,乾燥黏著組件設置以具有一附著區,附著區對應於基板的背側表面的至少75百分比(%),特別是乾燥黏著組件可設置以具有一附著區,附著區對應於基板的背側表面的至少80百分比(%),更特別是基板的背側表面的至少90百分比(%)。According to some embodiments, which may be combined with other embodiments, the dry adhesive assembly is configured to have an attachment zone corresponding to at least 75 percent (%) of the backside surface of the substrate, in particular the dry adhesive component may be configured to have An attachment zone, the attachment zone corresponding to at least 80 percent (%) of the backside surface of the substrate, more particularly at least 90 percent (%) of the backside surface of the substrate.

根據可與其他所述實施例結合的一些實施例,乾燥黏著元件包括在該支撐主體之一第一區上的一第一黏著結構以及在該支撐主體之一第二區上的一第二黏著結構。第一黏著結構可具有一各向異性柔性(anisotropic flexibility),且不相同於第二黏著結構的各向異性柔性。舉例而言,第一黏著結構可具有平行於表面的各向異性柔性。乾燥黏著結構可包括從表面突出的第一黏著結構,其中第一黏著結構具有平行於表面的各向異性柔性。舉例而言,多個黏著結構可具有平行於表面的各向異性柔性。乾燥黏著結構可具有從表面突出的第二乾燥黏著結構。當用相同的力在相同方向上彎曲時,第一黏著結構不同地彎曲。According to some embodiments, which may be combined with other embodiments, the dry adhesive element comprises a first adhesive structure on a first region of the support body and a second adhesive on a second region of the support body structure. The first adhesive structure can have an anisotropic flexibility and is not the same as the anisotropic flexibility of the second adhesive structure. For example, the first adhesive structure can have anisotropic flexibility parallel to the surface. The dry adhesive structure can include a first adhesive structure that protrudes from the surface, wherein the first adhesive structure has an anisotropic flexibility parallel to the surface. For example, a plurality of adhesive structures can have anisotropic flexibility parallel to the surface. The dry adhesive structure can have a second dry adhesive structure that protrudes from the surface. When bent in the same direction with the same force, the first adhesive structure is bent differently.

根據可與其他所述實施例結合的一些實施例,示例性參照第6圖,乾燥黏著元件240可附接至基板101的背側表面115。乾燥黏著元件240可設置以提供用以固持基板101的一附著力。通常,係不處理基板的背側表面115。背側表面與前側表面或活性表面相對。乾燥黏著元件240可包括多個細絲(filaments)121,特別是多個細絲121用以附接基板101的背側表面115。細絲一詞可同義使用於黏著結構一詞。According to some embodiments that may be combined with other described embodiments, with reference to FIG. 6 exemplarily, the dry adhesive element 240 may be attached to the backside surface 115 of the substrate 101. The dry adhesive element 240 can be configured to provide an adhesion to hold the substrate 101. Typically, the backside surface 115 of the substrate is not processed. The dorsal surface is opposite the front side surface or the active surface. The dry adhesive element 240 can include a plurality of filaments 121, particularly a plurality of filaments 121 for attaching the backside surface 115 of the substrate 101. The term filament can be used synonymously with the term adhesive structure.

根據可與所述任何實施例結合的一些實施例,乾燥黏著元件包括一壁虎黏著劑(Gecko adhesive)。乾燥黏著組件的乾燥黏著元件之黏附能力,特別是可與壁虎腳之黏附特性相關。壁虎腳之黏附能力係由壁虎的腳上稱為剛毛之很多毛形延伸提供。值得注意的是,「合成剛毛材料」一詞可理解為一合成材料,模仿壁虎腳之自然黏附能力,及包括與壁虎腳類似之黏附能力。再者,「合成剛毛材料」一詞可與「合成壁虎剛毛材料」一詞或「壁虎膠帶材料」一詞以同義之方式使用。舉例而言,具有壁虎黏附材料之支撐主體可亦意指為壁虎吸座(G-chuck)。然而,本揭露不以此為限,及可使用適合用以固持基板之其他乾燥黏著元件。According to some embodiments, which may be combined with any of the embodiments described, the dry adhesive element comprises a Gecko adhesive. The ability of the dry adhesive component of the dry adhesive component to adhere, in particular, to the adhesion characteristics of the gecko foot. The adhesion of the gecko's feet is provided by a number of hair-shaped extensions of the gecko's feet called bristles. It is worth noting that the term "synthetic bristle material" can be understood as a synthetic material that mimics the natural adhesion of the gecko's feet and includes adhesions similar to the gecko's feet. Furthermore, the term "synthetic bristle material" may be used synonymously with the term "synthetic gecko bristle material" or "gecko tape material". For example, a support body having a gecko adhesion material can also be referred to as a gecko suction seat (G-chuck). However, the disclosure is not limited thereto, and other dry adhesive members suitable for holding the substrate may be used.

第7圖繪示一實施例之一橫切面示意圖之一真空處理設備200。基板101係藉由基板支撐件100支撐於非垂直位置,例如水平位置或實質上水平位置。基板係被支撐於一處理站220上方。基板101係藉由一乾燥黏著配置所支撐。處理站220可能包括用以濺鍍沉積的一旋轉靶材215。基板101可被固持而實質上平行於旋轉靶材215。Figure 7 is a diagram showing a vacuum processing apparatus 200 of a cross-sectional view of an embodiment. The substrate 101 is supported by the substrate support 100 in a non-vertical position, such as a horizontal position or a substantially horizontal position. The substrate system is supported above a processing station 220. The substrate 101 is supported by a dry adhesive configuration. Processing station 220 may include a rotating target 215 for sputtering deposition. The substrate 101 can be held substantially parallel to the rotating target 215.

遮罩230可配置於基板101的前側,特別是於基板101之前側表面102的邊緣103的前側。旋轉靶材215的材料222a係從待沉積的旋轉靶材215的表面射出至基板101的前側表面102上。從靶材215的表面217射出的材料222a通過旋轉靶材215的表面217和基板101的前側表面102之間的距離250,用以後續沉積於前側表面102上。微粒雜質222c落入真空處理腔室的底部280,其中當微粒雜質附著於基板表面時將降低裝置品質。舉例而言,距離250可小於300mm,特別是小於260mm,或特別是介於240mm和260mm。The mask 230 may be disposed on the front side of the substrate 101, particularly on the front side of the edge 103 of the front side surface 102 of the substrate 101. The material 222a of the rotating target 215 is ejected from the surface of the rotating target 215 to be deposited onto the front side surface 102 of the substrate 101. The material 222a emerging from the surface 217 of the target 215 passes through a distance 250 between the surface 217 of the target 215 and the front side surface 102 of the substrate 101 for subsequent deposition on the front side surface 102. Particulate impurities 222c fall into the bottom 280 of the vacuum processing chamber where the particulate matter will degrade device quality when attached to the substrate surface. By way of example, the distance 250 can be less than 300 mm, in particular less than 260 mm, or in particular between 240 mm and 260 mm.

根據可與所述任何實施例結合的一些實施例,遮罩係配置於基板的前側且遮罩覆蓋基板的一邊緣區。舉例而言,遮罩可為一邊緣排除遮罩(edge exclusion mask)或一陰影遮罩(shadow mask)或類似物。邊緣排除遮罩係為設置以用以遮蔽基板之一或多個邊緣區域之遮罩,使得在基板塗佈期間和/或處理期間係沒有材料沈積於此一或多個邊緣區域上。According to some embodiments, which may be combined with any of the embodiments described, the mask is disposed on a front side of the substrate and the mask covers an edge region of the substrate. For example, the mask can be an edge exclusion mask or a shadow mask or the like. The edge exclusion mask is a mask disposed to shield one or more edge regions of the substrate such that no material is deposited on the one or more edge regions during substrate coating and/or during processing.

處理站可理解為包括用以處理基板的一個或多個設備的站。用於處理的裝置可為例如塗層基板的前側表面的裝置。舉例而言,濺射源或氣相沉積源可用於塗佈基板的前側表面。尤其,物理氣相沉積或化學氣相沉積裝置和類似物可作為處理裝置使用。A processing station can be understood to be a station that includes one or more devices to process a substrate. The means for treating may be, for example, a device that coats the front side surface of the substrate. For example, a sputtering source or a vapor deposition source can be used to coat the front side surface of the substrate. In particular, physical vapor deposition or chemical vapor deposition apparatus and the like can be used as a processing apparatus.

如上所述,在低於基板例如玻璃、邊緣排除、邊緣排除遮罩或遮罩之後設置塗佈源,該塗佈源可以是平面或旋轉靶材。根據可與其他所述實施例結合的一些實施例,可藉由乾燥黏著配置減小玻璃和遮罩之間的距離。玻璃遮罩之間的距離可以盡可能的小,因為玻璃邊緣是直的並且沒有夾具會干擾邊緣排除(即遮罩)。As noted above, a coating source is provided after the substrate, such as glass, edge exclusion, edge exclusion mask, or mask, which may be a planar or rotating target. According to some embodiments, which may be combined with other described embodiments, the distance between the glass and the mask may be reduced by a dry adhesive configuration. The distance between the glass masks can be as small as possible because the edges of the glass are straight and no fixture can interfere with edge exclusion (ie, masking).

文中所述的實施例提供懸掛有一基板(例如玻璃)之處理或塗佈區以主動側(及前側表面)面向下。微粒雜質隨著重力而從活動側落下。此外,玻璃夾具的微粒雜質係不產生。The embodiments described herein provide a treatment or coating zone in which a substrate (e.g., glass) is suspended with the active side (and front side surface) facing down. Particulate impurities fall from the active side with gravity. In addition, particulate impurities of the glass jig are not produced.

根據實施例,提供一真空處理設備。處理設備包括具有如文中所述支撐主體之基板支撐件,以及具有文中所述一或多個乾燥黏著元件之支撐主體上的乾燥黏著配置。一或多個乾燥黏著元件係設置以在處理站中於背側表面的至少一中心區域和一外部區域支撐如文中所述基板,其中處理站係至少部分地在基板的下方。According to an embodiment, a vacuum processing apparatus is provided. The processing apparatus includes a substrate support having a support body as described herein, and a dry adhesive configuration on the support body having one or more of the dry adhesive elements described herein. One or more dry adhesive elements are disposed to support the substrate as described herein in at least a central region and an outer region of the backside surface in the processing station, wherein the processing station is at least partially below the substrate.

參照第8圖,繪示覆蓋基板前側表面102的一區段102a之一遮罩230的放大視圖。基板前側表面102的區段102a是應保持無微粒雜質之基板前側基板的部分,特別是不被處理。虛線104分隔出待處理之前側表面102的區段及不被處理之表面的區段102a。元件符號104a定義出位於區段102a和區段102b之間的一邊界表面區104a。由於水平的處理,微粒雜質222c傾向平行於處理方向272而移動面向基板前側表面102。在邊界表面區104a之沉積表面和非沉積表面之間的維度104b係實質上由遮罩230和前側表面102之間的距離305、微粒雜質222c的處理方向272、及微粒雜質222c的尺寸所決定。小的距離305,係可導致邊界表面區104a的一小的維度104b,特別是改善的遮罩排除(improved edge exclusion)或邊緣的陰影(shadowing of the edge)。Referring to Fig. 8, an enlarged view of one of the masks 230 covering a section 102a of the substrate front side surface 102 is shown. The section 102a of the substrate front side surface 102 is a portion of the substrate front side substrate which should be kept free of particulate impurities, and is particularly untreated. The dashed line 104 separates the section of the front side surface 102 to be treated and the section 102a of the untreated surface. Element symbol 104a defines a boundary surface area 104a between section 102a and section 102b. Due to the horizontal processing, the particulate impurities 222c tend to move parallel to the process direction 272 and face the substrate front side surface 102. The dimension 104b between the deposition surface and the non-deposition surface of the boundary surface region 104a is substantially determined by the distance 305 between the mask 230 and the front side surface 102, the processing direction 272 of the particulate impurity 222c, and the size of the particulate impurity 222c. . The small distance 305 can result in a small dimension 104b of the boundary surface region 104a, particularly improved edge exclusion or shadowing of the edge.

相較於垂直或實質上垂直基板配置,產生於處理設備例如靶材連結縫隙或邊緣排除遮罩的微粒雜質將隨著重力而更不易抵達基板的活性表面。此外,藉由夾具產生之微粒雜質係藉由例如壁虎吸盤的乾燥黏著配置而可避免的。此外,乾燥黏著配置允許一更小的遮罩-基板-距離,相較於藉由夾具所支撐的基板。此允許一改善的遮蔽。Particle impurities generated in a processing device such as a target joining slit or an edge exclusion mask will be less accessible to the active surface of the substrate with gravity than a vertical or substantially vertical substrate configuration. In addition, particulate impurities generated by the jig can be avoided by a dry adhesive configuration such as a gecko suction cup. In addition, the dry adhesive configuration allows for a smaller mask-substrate-distance compared to the substrate supported by the clamp. This allows for an improved shadowing.

根據實施例,提供一種處理基板的方法。方法包括根據本文實施例所述的基板支撐件,其中支撐主體係固持基板於非垂直位置以及基板的背側表面係附接至乾燥黏著元件而基板的前側表面係面向下於處理站中。詞語「面向下」可理解為如本文所述其中面向下於處理站中以使得基板的前側表面面向處理站,此處理站係至少部分於基板支撐的下方,特別是於基板的下方。支撐面向下的基板面向處理站可使基板的前側表面的水平處理成為可能。According to an embodiment, a method of processing a substrate is provided. The method includes a substrate support according to embodiments herein, wherein the support main system holding substrate is attached to the dry adhesive element in a non-vertical position and the back side surface of the substrate is attached to the front side surface of the substrate facing down into the processing station. The phrase "facing downward" is understood to mean that the front side surface of the substrate faces the processing station as described herein such that the processing station is at least partially below the substrate support, particularly below the substrate. Supporting the substrate facing downward facing the processing station enables horizontal processing of the front side surface of the substrate.

第9圖示出敘述一種用以處理根據本文所述實施例的基板的方法之一流程圖。方法400包括方塊410之傳輸基板其中基板的前側表面面向上、方塊420之附接基板的背側至如本文所述的支撐主體、方塊430之將基板上下反轉其中待處理之前側表面係面向下、方塊440之移動基板於處理區、方塊450之處理如本文所述之面向下的基板。Figure 9 shows a flow chart describing a method for processing a substrate in accordance with embodiments described herein. The method 400 includes the transfer substrate of block 410 with the front side surface of the substrate facing up, the back side of the attachment substrate of block 420 to the support body as described herein, and the block 430 reversing the substrate upside down with the front side surface facing to be treated facing Next, the moving substrate of block 440 is processed in the processing region, block 450, as described herein below.

第10圖示出根據本文所述實施例之另一用以處理基板的方法500之一流程圖。方法500包括方塊510之附接基板背側至支撐主體而其中基板的前側面向下、方塊520之移動基板於一處理區、方塊530之處理如本文所述之面向下的基板前側表面、方塊540之移動基板離開處理區而其中基板的前側表面係如本文所述面向下。FIG. 10 illustrates one flow diagram of another method 500 for processing a substrate in accordance with embodiments described herein. The method 500 includes the attachment of the back side of the substrate 510 to the support body with the front side of the substrate down, the moving substrate of the block 520 in a processing area, the processing of the block 530, the front side surface of the substrate facing down as described herein, the block The moving substrate of 540 exits the processing zone and wherein the front side surface of the substrate faces downward as described herein.

根據實施例,提供一種基板處理系統,此基板處理系統包括一附載模組、一真空傳送腔室、以及如本文所述之真空處理設備。處理系統可包括超過一或多個負載模組、傳送腔室或真空處理設備。基板處理系統包括一真空傳送系統而其中提供超過一個(特別是多個)真空傳送腔室。可從頂部夾持基板至處理模組,也可從底部夾持基板並上下反轉。可提供懸掛於壁虎吸盤(即基板支撐件)的未塗佈的玻璃至處理模組,此壁虎吸盤(即此基板支撐件)係安裝於傳輸系統上。In accordance with an embodiment, a substrate processing system is provided that includes an attached module, a vacuum transfer chamber, and a vacuum processing apparatus as described herein. The processing system can include more than one or more load modules, transfer chambers, or vacuum processing equipment. The substrate processing system includes a vacuum transfer system in which more than one (particularly multiple) vacuum transfer chambers are provided. The substrate can be clamped from the top to the processing module, or the substrate can be clamped from the bottom and inverted upside down. An uncoated glass suspended from the gecko suction cup (ie, the substrate support) can be provided to the processing module, and the gecko suction cup (ie, the substrate support) is mounted on the transport system.

負載模組可理解為可用以供入或接受基板的一模組。負載模組可為一腔室,於一側具有設置成接收基板的一開孔。可連結負載模組至傳輸裝置,此傳輸裝置係設置以傳輸基板至負載模組。舉例而言,負載模組可理解為一氣閘,用以將基板傳送至具有低壓的腔室,特別是傳送至具有真空壓的腔室。根據實施例,連結負載模組至真空傳送腔室。A load module can be understood as a module that can be used to feed or receive a substrate. The load module can be a chamber having an opening disposed on one side to receive the substrate. The load module can be coupled to a transmission device that is configured to transport the substrate to the load module. For example, a load module can be understood as an air brake for transferring a substrate to a chamber having a low pressure, in particular to a chamber having a vacuum pressure. According to an embodiment, the load module is coupled to the vacuum transfer chamber.

真空傳送腔室可理解為具有真空壓的一腔室,此具有真空壓的腔室被連結至其他基板處理模組、腔室或裝置。真空傳送腔室可設置以移動基板至其他連結至真空傳送腔室之模組或裝置,用以基板再處理。根據實施例,超過一個真空處理設備可配置於真空傳送腔室,特別是於真空傳送腔室的外壁。真空傳送腔室可形成此些真空處理設備之間的一傳輸路徑。A vacuum transfer chamber can be understood as a chamber having a vacuum pressure that is coupled to other substrate processing modules, chambers or devices. The vacuum transfer chamber can be configured to move the substrate to other modules or devices coupled to the vacuum transfer chamber for substrate reprocessing. According to an embodiment, more than one vacuum processing apparatus may be disposed in the vacuum transfer chamber, particularly the outer wall of the vacuum transfer chamber. The vacuum transfer chamber can form a transport path between such vacuum processing equipment.

真空傳送腔室可理解為一傳輸路徑設置,其中數個基板處理模組(如處理設備)係配置於傳輸路徑設置的側面區。例如藉由一開孔或藉由一氣閘,每個基板處理模組或基板處理系統可被連結至傳輸路徑設置。The vacuum transfer chamber can be understood as a transmission path setting in which a plurality of substrate processing modules (such as processing devices) are disposed in the side regions of the transmission path arrangement. Each substrate processing module or substrate processing system can be coupled to a transmission path setting, such as by an aperture or by an airlock.

根據實施例,基板處理系統可包括(至少部分地)超過一個配置鄰近於彼此的基板處理設備,其中第一處理設備中支撐主體所支撐之基板係被移動進入如本文所述處理站的處理區。為了再處理,可沿著又一處理設備移動載體而其中載體係於非垂直位置沿著處理設備的處理站旁邊移動。沿著處理站旁邊之基板支撐件的移動可以固定速度、或可變速度進行。According to an embodiment, a substrate processing system can include (at least in part) more than one substrate processing apparatus disposed adjacent to each other, wherein a substrate supported by the support body in the first processing apparatus is moved into a processing area of a processing station as described herein . For further processing, the carrier can be moved along a further processing device wherein the carrier is moved alongside the processing station of the processing device in a non-vertical position. Movement of the substrate support alongside the processing station can be performed at a fixed speed, or at a variable speed.

本揭露包括數個優點,包括提供一基板支撐件,用以固持基板於被側面上而不需要影響前側或側向表面的其他固持配置。本文所述的基板支撐件使處理於非垂直位置的一基板成為可能,而不需要側向沉積於接觸玻璃邊緣之其他固持配置。由於避免較大的微粒雜質沉積在基板表面上,因此非垂直基板處理使更薄的塗佈以及更細緻的塗佈成為可能。The present disclosure includes several advantages, including providing a substrate support for holding the substrate on the side without requiring additional retention of the front or lateral surface. The substrate support described herein enables a substrate to be processed in a non-vertical position without the need for other retention configurations that are laterally deposited on the edge of the contact glass. Non-vertical substrate processing enables thinner coating and finer coating by avoiding the deposition of larger particulate impurities on the substrate surface.

100‧‧‧基板支撐件100‧‧‧Substrate support

101‧‧‧基板101‧‧‧Substrate

102‧‧‧前側表面102‧‧‧ front side surface

102a‧‧‧區段Section 102a‧‧‧

102b‧‧‧區段Section 102b‧‧‧

103‧‧‧邊緣103‧‧‧ edge

104‧‧‧虛線104‧‧‧dotted line

104a‧‧‧邊界表面區104a‧‧‧Boundary surface area

104b‧‧‧維度104b‧‧‧Dimensions

105‧‧‧乾燥黏著組件105‧‧‧ Dry adhesive components

110‧‧‧表面110‧‧‧ surface

114‧‧‧間隙區114‧‧‧clear area

115‧‧‧背側表面115‧‧‧ Back side surface

116‧‧‧外部邊緣116‧‧‧External edge

118‧‧‧角落邊緣118‧‧‧ corner edge

120‧‧‧中心固持件120‧‧‧Center Holder

121‧‧‧細絲121‧‧‧ filament

130‧‧‧外部固持件130‧‧‧External holding parts

145‧‧‧中心145‧‧ Center

200‧‧‧真空處理設備200‧‧‧ Vacuum processing equipment

215‧‧‧旋轉靶材215‧‧‧Rotating target

217‧‧‧表面217‧‧‧ surface

220‧‧‧處理站220‧‧‧Processing station

222a‧‧‧材料222a‧‧‧Materials

222c‧‧‧微粒雜質222c‧‧‧Particle impurities

225a、225b、225c、225d‧‧‧可動固持件225a, 225b, 225c, 225d‧‧‧ movable retaining parts

230‧‧‧遮罩230‧‧‧ mask

235‧‧‧心軸235‧‧‧ mandrel

240‧‧‧乾燥黏著元件240‧‧‧ Dry adhesive components

245‧‧‧徑向路徑245‧‧‧ radial path

250‧‧‧距離250‧‧‧ distance

255‧‧‧徑向向外方向255‧‧‧ radially outward

265‧‧‧角落邊緣265‧‧‧ corner edge

272‧‧‧處理方向272‧‧‧Processing direction

280‧‧‧底部280‧‧‧ bottom

305‧‧‧底部305‧‧‧ bottom

335a、335b、335c、335d‧‧‧可動中心固持件335a, 335b, 335c, 335d‧‧‧ movable center holding parts

345a、345b、345c、345d‧‧‧可動外部固持件345a, 345b, 345c, 345d‧‧‧ movable external holding parts

400、500‧‧‧方法400, 500‧‧‧ method

410、420、430、440、450、510、520、530、540‧‧‧方塊410, 420, 430, 440, 450, 510, 520, 530, 540‧‧‧ blocks

為了可了解上述之特點的細節,更詳細的說明會及簡要摘錄於上係配合實施例提供。所附圖式係有關於實施例且係說明如下: 第1圖繪示包括具有一中心固持件和多個外部固持件的一乾燥黏著組件之一示例性基板支撐件的俯視示意圖。 第2圖繪示另一範例之包括一中心固持件和多個外部固持件之一基板支撐件的俯視示意圖。 第3圖繪示另一範例之包括一中心固持件和具有一類閉環設計(closed-ring-like design)的多個外部固持件之一基板支撐件的上視示意圖。 第4圖繪示一實施例的另一範例之包括四個可動固持件之一基板支撐件的俯視示意圖。 第5圖繪示一實施例的另一範例之包括四個可動中心固持件和四個可動外部固持件之一基板支撐件的俯視示意圖。 第6圖繪示包括於其支撐主體上的一乾燥黏著組件之一示例性基板支撐件的橫截面側視示意圖。 第7圖繪示一實施例之一真空處理設備的橫截面側視示意圖,其中一基板的一前側表面係被支撐於一非垂直位置而於一處理站上方。 第8圖繪示覆蓋基板前側表面的一部分之一遮罩的放大視圖。 第9圖繪示一流程圖,其說明了根據文中所述之實施例用以處理一基板的一方法。 第10圖繪示另一流程圖,其說明了根據文中所述之實施例用以處理一基板的另一方法。In order to understand the details of the above features, a more detailed description and a brief summary are provided in the above embodiments. The drawings are described with respect to the embodiments and are as follows: Figure 1 is a top plan view of an exemplary substrate support comprising a dry adhesive assembly having a central retaining member and a plurality of outer retaining members. FIG. 2 is a top plan view showing another example of a substrate support including a center holder and a plurality of external holders. FIG. 3 is a top plan view showing another example of a substrate support including a center holder and a plurality of external holders having a closed-ring-like design. FIG. 4 is a top plan view showing another example of a substrate support including four movable holders according to another embodiment of the embodiment. FIG. 5 is a top plan view showing another example of a substrate support including four movable center holders and four movable external holders. Figure 6 is a cross-sectional side elevational view of an exemplary substrate support of one of the dry adhesive components included on its support body. Figure 7 is a cross-sectional side elevational view of a vacuum processing apparatus of an embodiment in which a front side surface of a substrate is supported in a non-vertical position above a processing station. Figure 8 is an enlarged view showing a mask covering a portion of the front side surface of the substrate. Figure 9 is a flow chart illustrating a method for processing a substrate in accordance with an embodiment described herein. Figure 10 illustrates another flow diagram illustrating another method for processing a substrate in accordance with embodiments described herein.

no

Claims (20)

一種基板支撐件,用以支撐具有待處理之一前側表面和相對之一背側表面的一基板,該基板支撐件包括: 一支撐主體;及 一乾燥黏著組件,附接至該支撐主體,該乾燥黏著組件具有一或多個乾燥黏著元件,其中該一或多個乾燥黏著元件於該背側表面的至少一中心區域和一外部區域支撐基板。a substrate support member for supporting a substrate having a front side surface and a back side surface to be processed, the substrate support comprising: a support body; and a dry adhesive assembly attached to the support body, The dry adhesive assembly has one or more dry adhesive elements, wherein the one or more dry adhesive elements support the substrate in at least a central region and an outer region of the backside surface. 如申請專利範圍第1項所述之基板支撐件,其中該基板支撐件設置以固持該基板於一非垂直位置,該基板的該背側表面係附接至該一或多個乾燥黏著元件以及該基板的該前側表面係面向下。The substrate support of claim 1, wherein the substrate support is disposed to hold the substrate in a non-vertical position, the back side surface of the substrate being attached to the one or more dry adhesive elements and The front side surface of the substrate faces downward. 如申請專利範圍第1項所述之基板支撐件,其中該乾燥黏著組件設置以形成一或多個固持件於該支撐主體上。The substrate support of claim 1, wherein the dry adhesive assembly is configured to form one or more holders on the support body. 如申請專利範圍第2項所述之基板支撐件,其中該乾燥黏著組件設置以形成一或多個固持件於該支撐主體上。The substrate support of claim 2, wherein the dry adhesive assembly is configured to form one or more holders on the support body. 如申請專利範圍第3項所述之基板支撐件,其中該一或多個固持件係可動地配置於該支撐主體上。The substrate support of claim 3, wherein the one or more holders are movably disposed on the support body. 如申請專利範圍第5項所述之基板支撐件,其中該基板支撐件更包括四個固持件,設置成可移動於一徑向向外方向(radially outwards direction)或一徑向向內方向(radially inwards direction)上。The substrate support of claim 5, wherein the substrate support further comprises four holders arranged to be movable in a radially outwards direction or a radially inward direction ( Budget inwards direction). 如申請專利範圍第5項所述之基板支撐件,其中該基板支撐件更包括四個固持件,設置成可移動於一徑向向外方向(radially outwards direction)和一徑向向內方向(radially inwards direction)上。The substrate support of claim 5, wherein the substrate support further comprises four holders arranged to be movable in a radially outwards direction and a radially inward direction ( Budget inwards direction). 如申請專利範圍第1至7項任一項所述之基板支撐件,其中該乾燥黏著組件設置以具有一附接區,該附接區對應為該基板的該背側表面之至少75百分比(%)。The substrate support of any one of claims 1 to 7, wherein the dry adhesive assembly is configured to have an attachment area corresponding to at least 75 percent of the back side surface of the substrate ( %). 如申請專利範圍第1至7項任一項所述之基板支撐件,其中該一或多個乾燥黏著元件包括在該支撐主體之一第一區上的一第一黏著結構以及在該支撐主體之一第二區上的一第二黏著結構。The substrate support according to any one of claims 1 to 7, wherein the one or more dry adhesive elements comprise a first adhesive structure on a first region of the support body and a support body A second adhesive structure on one of the second zones. 如申請專利範圍第8項所述之基板支撐件,其中該一或多個乾燥黏著元件包括在該支撐主體之一第一區上的一第一黏著結構以及在該支撐主體之一第二區上的一第二黏著結構。The substrate support of claim 8, wherein the one or more dry adhesive elements comprise a first adhesive structure on a first region of the support body and a second region in the support body A second adhesive structure on the top. 如申請專利範圍第1至7項任一項所述之基板支撐件,其中該一或多個乾燥黏著元件包括一壁虎黏著劑(Gecko adhesive)。The substrate support of any one of claims 1 to 7 wherein the one or more dry adhesive elements comprise a Gecko adhesive. 如申請專利範圍第8項所述之基板支撐件,其中該一或多個乾燥黏著元件包括一壁虎黏著劑(Gecko adhesive)。The substrate support of claim 8, wherein the one or more dry adhesive elements comprise a Gecko adhesive. 如申請專利範圍第9項所述之基板支撐件,其中該一或多個乾燥黏著元件包括一壁虎黏著劑(Gecko adhesive)。The substrate support of claim 9, wherein the one or more dry adhesive elements comprise a Gecko adhesive. 一種用以處理一基板的方法,該方法包括: 固持該基板於一非垂直位置,該基板的一背側表面係附接至多個乾燥黏著元件,及該基板的一前側表面係面向下於一處理站上方。A method for processing a substrate, the method comprising: holding the substrate in a non-vertical position, a back side surface of the substrate is attached to the plurality of dry adhesive elements, and a front side surface of the substrate faces downward Above the processing station. 一種用以處理一基板的方法,該方法包括: 使用多個乾燥黏著元件附接該基板的一背側表面於一支撐主體上,待處理之該基板的一前側表面係面向上;及 將該支撐主體上下反轉以使待處理之該基板的一前側表面面向下。A method for processing a substrate, the method comprising: attaching a back side surface of the substrate to a support body using a plurality of dry adhesive elements, a front side surface of the substrate to be treated facing upward; and The support body is inverted upside down such that a front side surface of the substrate to be processed faces downward. 一種真空處理設備,包括: 一基板支撐件,包括: 一支撐主體;及 一乾燥黏著配置位於該支撐主體上,該乾燥黏著配置具有一或多個乾燥黏著元件,該一或多個乾燥黏著元件設置以於該背側表面的至少一中心區域和一外部區域支撐基板;及 一處理站,至少部分低於該基板支撐件。A vacuum processing apparatus comprising: a substrate support comprising: a support body; and a dry adhesive arrangement on the support body, the dry adhesive configuration having one or more dry adhesive elements, the one or more dry adhesive elements Providing at least one central region and an outer region supporting substrate for the back side surface; and a processing station at least partially lower than the substrate support. 如申請專利範圍第16項所述之真空處理設備,其中該基板支撐件設置以移動該基板於一非垂直位置移入和移出於該處理站。The vacuum processing apparatus of claim 16, wherein the substrate support is configured to move the substrate into and out of the processing station in a non-vertical position. 如申請專利範圍第16項所述之真空處理設備,其中配置一遮罩於該基板前,該遮罩覆蓋該基板的一邊緣區。The vacuum processing apparatus of claim 16, wherein a mask is disposed in front of the substrate, the mask covering an edge region of the substrate. 如申請專利範圍第17項所述之真空處理設備,其中配置一遮罩於該基板前,該遮罩覆蓋該基板的一邊緣區。The vacuum processing apparatus of claim 17, wherein a mask is disposed in front of the substrate, the mask covering an edge region of the substrate. 一種基板處理系統,包括: 一負載模組; 一真空傳送腔室;及 如申請專利範圍第16至19項任一項所述之真空處理設備。A substrate processing system comprising: a load module; a vacuum transfer chamber; and a vacuum processing apparatus according to any one of claims 16 to 19.
TW107139304A 2017-11-20 2018-11-06 A substrate support for supporting a substrate having a front surface to be processed and an opposing back surface, a method for processing a substrate, a vacuum processing apparatus and a substrate processing system TW201936949A (en)

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