TW201920554A - Adhesive film for circuit connections and manufacturing method thereof, manufacturing method of circuit connection structure, and adhesive film housing set - Google Patents

Adhesive film for circuit connections and manufacturing method thereof, manufacturing method of circuit connection structure, and adhesive film housing set Download PDF

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TW201920554A
TW201920554A TW107131739A TW107131739A TW201920554A TW 201920554 A TW201920554 A TW 201920554A TW 107131739 A TW107131739 A TW 107131739A TW 107131739 A TW107131739 A TW 107131739A TW 201920554 A TW201920554 A TW 201920554A
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adhesive layer
adhesive film
curable composition
circuit connection
adhesive
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TW107131739A
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Chinese (zh)
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TWI799445B (en
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森尻智樹
大當友美子
工藤直
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日商日立化成股份有限公司
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    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J11/00Features of adhesives not provided for in group C09J9/00, e.g. additives
    • C09J11/02Non-macromolecular additives
    • C09J11/04Non-macromolecular additives inorganic
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J11/00Features of adhesives not provided for in group C09J9/00, e.g. additives
    • C09J11/02Non-macromolecular additives
    • C09J11/06Non-macromolecular additives organic
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J4/00Adhesives based on organic non-macromolecular compounds having at least one polymerisable carbon-to-carbon unsaturated bond ; adhesives, based on monomers of macromolecular compounds of groups C09J183/00 - C09J183/16
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J7/00Adhesives in the form of films or foils
    • C09J7/10Adhesives in the form of films or foils without carriers
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J7/00Adhesives in the form of films or foils
    • C09J7/30Adhesives in the form of films or foils characterised by the adhesive composition
    • C09J7/35Heat-activated
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J9/00Adhesives characterised by their physical nature or the effects produced, e.g. glue sticks
    • C09J9/02Electrically-conducting adhesives
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01BCABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
    • H01B1/00Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors
    • H01B1/20Conductive material dispersed in non-conductive organic material
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/14Structural association of two or more printed circuits
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J2301/00Additional features of adhesives in the form of films or foils
    • C09J2301/20Additional features of adhesives in the form of films or foils characterized by the structural features of the adhesive itself
    • C09J2301/208Additional features of adhesives in the form of films or foils characterized by the structural features of the adhesive itself the adhesive layer being constituted by at least two or more adjacent or superposed adhesive layers, e.g. multilayer adhesive
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J2301/00Additional features of adhesives in the form of films or foils
    • C09J2301/30Additional features of adhesives in the form of films or foils characterized by the chemical, physicochemical or physical properties of the adhesive or the carrier
    • C09J2301/312Additional features of adhesives in the form of films or foils characterized by the chemical, physicochemical or physical properties of the adhesive or the carrier parameters being the characterizing feature
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73201Location after the connecting process on the same surface
    • H01L2224/73203Bump and layer connectors
    • H01L2224/73204Bump and layer connectors the bump connector being embedded into the layer connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/83Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
    • H01L2224/831Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector the layer connector being supplied to the parts to be connected in the bonding apparatus
    • H01L2224/83101Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector the layer connector being supplied to the parts to be connected in the bonding apparatus as prepeg comprising a layer connector, e.g. provided in an insulating plate member

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  • Chemical & Material Sciences (AREA)
  • Organic Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Dispersion Chemistry (AREA)
  • Inorganic Chemistry (AREA)
  • Manufacturing & Machinery (AREA)
  • Adhesives Or Adhesive Processes (AREA)
  • Conductive Materials (AREA)
  • Non-Insulated Conductors (AREA)
  • Laminated Bodies (AREA)
  • Adhesive Tapes (AREA)
  • Manufacturing Of Electrical Connectors (AREA)

Abstract

This adhesive film 1 for circuit connections is provided with a first adhesive layer 2 containing conductive particles 4, and a second adhesive layer 3 laminated on said first adhesive layer 2, wherein the ratio of the melt viscosity of the first adhesive layer 2 at the temperature at which the second adhesive layer 3 exhibits the lowest melt viscosity, to said lowest melt viscosity of the second adhesive layer 3 is greater than or equal to 10.

Description

電路連接用接著劑膜及其製造方法、電路連接結構體的製造方法及接著劑膜收容套組Adhesive film for circuit connection and manufacturing method thereof, method for manufacturing circuit connection structure, and adhesive film storage kit

本發明是有關於一種電路連接用接著劑膜及其製造方法、電路連接結構體的製造方法及接著劑膜收容套組。The invention relates to an adhesive film for circuit connection, a method for manufacturing the same, a method for manufacturing a circuit connection structure, and an adhesive film storage kit.

先前,為了進行電路連接而使用各種接著材料。例如,作為用於液晶顯示器與帶載封裝體(tape carrier package,TCP)的連接、可撓性印刷配線基板(Flexible Printed Circuit,FPC)與TCP的連接、或FPC與印刷配線板的連接的接著材料,一直使用接著劑中分散有導電粒子且具有各向異性導電性的電路連接用接著劑膜。具體而言,利用由電路連接用接著劑膜所形成的電路連接部,將電路構件彼此接著,並且將電路構件上的電極彼此經由電路連接部中的導電粒子而電性連接,藉此而獲得電路連接結構體。Conventionally, various bonding materials have been used for circuit connection. For example, it is used for connection between a liquid crystal display and a tape carrier package (TCP), connection between a flexible printed wiring board (Flexible Printed Circuit, FPC) and TCP, or connection between FPC and a printed wiring board. As the material, an adhesive film for circuit connection having conductive particles dispersed in the adhesive and having anisotropic conductivity has been used. Specifically, a circuit connection portion formed of an adhesive film for circuit connection is used to connect circuit members to each other, and electrodes on the circuit members are electrically connected to each other via conductive particles in the circuit connection portion, thereby obtaining Circuit connection structure.

於使用具有各向異性導電性的電路連接用接著劑膜的精密電子設備的領域中,推進電路的高密度化,電極寬度及電極間隔變得極窄。因此,於微小電極上效率良好地捕捉導電粒子來獲得高連接可靠性未必容易。In the field of precision electronic equipment using an anisotropic conductive adhesive film for circuit connection, the density of circuits is promoted, and the electrode width and the electrode interval are extremely narrow. Therefore, it is not necessarily easy to efficiently capture conductive particles on a minute electrode and obtain high connection reliability.

對此,例如專利文獻1中提出有使導電粒子偏向存在於各向異性導電性接著片的單側,將導電粒子彼此隔開的方法。 [現有技術文獻] [專利文獻]In this regard, for example, Patent Document 1 proposes a method in which conductive particles are biased to exist on one side of an anisotropic conductive adhesive sheet, and the conductive particles are separated from each other. [Prior Art Literature] [Patent Literature]

[專利文獻1]國際公開第2005/54388號[Patent Document 1] International Publication No. 2005/54388

[發明所欲解決之課題] 但是,當將使用現有的電路連接用接著劑膜而獲得的電路連接結構體放置於高溫高濕環境下(例如85℃、85%RH)時,存在電路構件與電路連接部之間產生剝離的情況。此種剝離會導致電路連接結構體的連接可靠性的降低。[Problems to be Solved by the Invention] However, when a circuit connection structure obtained by using an existing adhesive film for circuit connection is placed in a high temperature and high humidity environment (for example, 85 ° C, 85% RH), there are circuit components and Peeling may occur between circuit connection portions. Such peeling causes a reduction in connection reliability of the circuit connection structure.

因此,本發明的目的在於提供一種可獲得高溫高濕環境下難以產生電路構件與電路連接部之間的剝離的電路連接結構體的電路連接用接著劑膜及其製造方法、使用該接著劑膜的電路連接結構體的製造方法、以及包括該接著劑膜的接著劑膜收容套組。 [解決課題之手段]Therefore, an object of the present invention is to provide an adhesive film for circuit connection, which can obtain a circuit connection structure body in which peeling between a circuit member and a circuit connection portion is difficult to occur under a high temperature and high humidity environment, and a method for producing the same, and using the adhesive film A method for manufacturing a circuit connection structure and an adhesive film storage kit including the adhesive film. [Means for solving problems]

本發明的一方面的電路連接用接著劑膜包括:含有導電粒子的第1接著劑層、及積層於該第1接著劑層上的第2接著劑層,且第2接著劑層顯示最低熔融黏度的溫度下的第1接著劑層的熔融黏度相對於第2接著劑層的最低熔融黏度的比為10以上。An adhesive film for circuit connection according to an aspect of the present invention includes a first adhesive layer containing conductive particles and a second adhesive layer laminated on the first adhesive layer, and the second adhesive layer exhibits the lowest melting. The ratio of the melt viscosity of the first adhesive layer to the minimum melt viscosity of the second adhesive layer at a viscosity temperature is 10 or more.

根據該電路連接用接著劑膜,可獲得高溫高濕環境下(例如85℃、85%RH)難以產生電路構件與電路連接部之間的剝離的電路連接結構體。換言之,根據該電路連接用接著劑膜,可提升高溫高濕環境下的電路構件與電路連接部的密接性。進而,根據該電路連接用接著劑膜,可降低電路連接結構體的相向電極的連接電阻,並且於高溫高濕環境下(例如85℃、85%RH)亦可維持低連接電阻。即,根據該電路連接用接著劑膜,可提升電路連接結構體的連接可靠性。According to the adhesive film for circuit connection, it is possible to obtain a circuit connection structure in which a peeling between a circuit member and a circuit connection portion is unlikely to occur in a high-temperature and high-humidity environment (for example, 85 ° C., 85% RH). In other words, according to the adhesive film for circuit connection, the adhesion between the circuit member and the circuit connection portion in a high temperature and high humidity environment can be improved. Furthermore, according to this adhesive film for circuit connection, the connection resistance of the opposing electrodes of the circuit connection structure can be reduced, and the connection resistance can also be maintained low in a high temperature and high humidity environment (for example, 85 ° C, 85% RH). That is, according to this adhesive film for circuit connection, the connection reliability of a circuit connection structure can be improved.

本發明的一方面的電路連接用接著劑膜的製造方法包括:準備步驟,準備第1接著劑層;以及積層步驟,於第1接著劑層上積層包含第2硬化性組成物的第2接著劑層,且準備步驟包括藉由對包含含有導電粒子的第1硬化性組成物的層進行光照射或加熱而使第1硬化性組成物硬化,獲得第1接著劑層的硬化步驟,硬化步驟中,以第2接著劑層顯示最低熔融黏度的溫度下的第1接著劑層的熔融黏度相對於第2接著劑層的最低熔融黏度的比為10以上的方式使第1硬化性組成物硬化。根據該方法,可獲得如下電路連接用接著劑膜,其可獲得高溫高濕環境下難以產生電路構件與電路連接部之間的剝離的電路連接結構體。A method for producing an adhesive film for circuit connection according to an aspect of the present invention includes a preparation step of preparing a first adhesive layer, and a laminating step of laminating a second adhesive including a second curable composition on the first adhesive layer. And a preparation step including a step of hardening the first curable composition by light irradiation or heating of the layer containing the first curable composition containing conductive particles to obtain a first adhesive layer, and a curing step The first hardenable composition is hardened such that the ratio of the melt viscosity of the first adhesive layer to the minimum melt viscosity of the second adhesive layer at a temperature at which the second adhesive layer exhibits the lowest melt viscosity is 10 or more. . According to this method, an adhesive film for circuit connection can be obtained, which can obtain a circuit connection structure in which peeling between a circuit member and a circuit connection portion is unlikely to occur in a high temperature and high humidity environment.

第1接著劑層可包含第1硬化性組成物的硬化物,第1硬化性組成物亦可含有具有自由基聚合性基的自由基聚合性化合物。The first adhesive layer may include a cured product of the first curable composition, and the first curable composition may contain a radical polymerizable compound having a radical polymerizable group.

第2接著劑層可包含第2硬化性組成物,第2硬化性組成物亦可含有具有自由基聚合性基的自由基聚合性化合物。The second adhesive layer may contain a second curable composition, and the second curable composition may contain a radical polymerizable compound having a radical polymerizable group.

第1接著劑層的厚度可為導電粒子的平均粒徑的0.2倍~0.8倍。The thickness of the first adhesive layer may be 0.2 to 0.8 times the average particle diameter of the conductive particles.

本發明的一方面的電路連接結構體的製造方法包括以下步驟:使以上所述的電路連接用接著劑膜介於具有第1電極的第1電路構件、與具有第2電極的第2電路構件之間,將第1電路構件及第2電路構件熱壓接,而使第1電極及第2電極彼此電性連接。根據該方法,可獲得高溫高濕環境下難以產生電路構件與電路連接部之間的剝離的電路連接結構體。A method for manufacturing a circuit connection structure according to an aspect of the present invention includes the steps of interposing the adhesive film for circuit connection described above between a first circuit member having a first electrode and a second circuit member having a second electrode. In between, the first circuit member and the second circuit member are thermocompression-bonded to electrically connect the first electrode and the second electrode to each other. According to this method, it is possible to obtain a circuit connection structure in which peeling between a circuit member and a circuit connection portion is unlikely to occur in a high temperature and high humidity environment.

本發明的一方面的接著劑膜收容套組包括以上所述的電路連接用接著劑膜、及收容該接著劑膜的收容構件,收容構件具有使得能夠自外部視認收容構件的內部的視認部,視認部對波長365 nm的光的透射率為10%以下。An adhesive film storage kit according to an aspect of the present invention includes the above-mentioned adhesive film for circuit connection, and a storage member for accommodating the adhesive film. The storage member has a viewing portion that allows the inside of the storage member to be viewed from the outside. The visible part has a transmittance of 10% or less for light having a wavelength of 365 nm.

但是,一般而言,使用電路連接用接著劑膜的環境是被稱為無塵室(clean room)且以一定水準管理室內的溫度、濕度及清潔度的房間。當電路連接用接著劑膜自生產現場出貨時,將電路連接用接著劑膜收容至包裝袋等收容構件中,以免直接暴露於外部氣體而因灰塵及濕氣導致品質下降。通常,於該收容構件設置有視認部,所述視認部是由透明的材料形成,以便自收容構件的外部亦可確認貼附於內部的接著劑膜上的製品名、批號、有效期等各種資訊。However, in general, the environment in which the adhesive film for circuit connection is used is a room called a clean room and the temperature, humidity, and cleanliness of the room are managed at a certain level. When the adhesive film for circuit connection is shipped from the production site, the adhesive film for circuit connection is stored in a storage member such as a packaging bag, so as not to be directly exposed to external air and deteriorated by dust and moisture. Generally, a viewing portion is provided on the storage member, and the viewing portion is formed of a transparent material, so that various information such as a product name, a batch number, and an expiration date attached to the internal adhesive film can be confirmed from the outside of the storage member. .

然而,根據本發明者等人的研究得知,當收容於現有的收容構件來進行保管或搬運後使用以上所述的電路連接用接著劑膜時,有時會產生於高溫高濕環境下容易產生電路構件與電路連接部之間的剝離、接著劑膜的連接電阻的降低效果減小等不良狀況。基於此種研究結果,本發明者等人進一步進行研究,結果得知,當第1接著劑層包含光硬化性組成物的硬化物,第2接著劑層包含含有可與該光硬化性組成物中的光聚合起始劑反應的聚合性化合物的硬化性組成物時,於接著劑膜的保管中及搬運中第2接著劑層硬化,產生所述不良狀況。因此,基於藉由源自第1接著劑層中殘留的光聚合起始劑的自由基而進行第2接著劑層中的聚合性化合物的聚合這一推測,本發明者等人進一步進行研究,結果發現,藉由製成包括所述特定的收容構件的接著劑膜收容套組,可抑制保管時或搬運時的第2接著劑層的硬化,且可抑制所述不良狀況的產生。However, according to research by the present inventors, it has been found that when the above-mentioned adhesive film for circuit connection is used after being stored or transported in an existing storage member, it may be easily generated in a high temperature and high humidity environment. Defects such as peeling between the circuit member and the circuit connection portion, and a reduction in the effect of reducing the connection resistance of the adhesive film occur. Based on the results of such studies, the present inventors and others conducted further studies, and as a result, it was found that when the first adhesive layer contains a cured product of the photocurable composition, the second adhesive layer includes In the case of the curable composition of the polymerizable compound in which the photopolymerization initiator reacts during the curing, the second adhesive layer is hardened during storage and transportation of the adhesive film, and the above-mentioned problem occurs. Therefore, based on the assumption that the polymerizable compound in the second adhesive agent layer is polymerized by radicals derived from the photopolymerization initiator remaining in the first adhesive agent layer, the present inventors and others have further studied, As a result, it was found that by forming the adhesive film storage kit including the specific storage member, it is possible to suppress the hardening of the second adhesive layer during storage or transportation, and to suppress the occurrence of the problem.

即,根據本發明的一方面的接著劑膜收容套組,當使用可與第1接著劑層中的光聚合起始劑反應的化合物作為第2接著劑層中的聚合性化合物時,可抑制接著劑膜的保管時或搬運時第2接著劑層的硬化,可抑制於高溫高濕環境下容易產生電路構件與電路連接部之間的剝離、接著劑膜的連接電阻的降低效果減小等不良狀況的產生。 [發明的效果]That is, according to the adhesive film storage kit according to an aspect of the present invention, when a compound capable of reacting with the photopolymerization initiator in the first adhesive layer is used as the polymerizable compound in the second adhesive layer, it can be suppressed. The hardening of the second adhesive layer during storage or transportation of the adhesive film can prevent peeling between the circuit member and the circuit connection part easily in a high temperature and high humidity environment, and reduce the reduction effect of the connection resistance of the adhesive film. The occurrence of adverse conditions. [Effect of the invention]

根據本發明,可提供一種可獲得高溫高濕環境下難以產生電路構件與電路連接部之間的剝離的電路連接結構體的電路連接用接著劑膜及其製造方法、使用該接著劑膜的電路連接結構體的製造方法、以及包括該接著劑膜的接著劑膜收容套組。According to the present invention, it is possible to provide an adhesive film for circuit connection, which can obtain a circuit connection structure body in which peeling between a circuit member and a circuit connection portion is difficult to occur under a high temperature and high humidity environment, a method for manufacturing the same, and a circuit using the same A method for manufacturing a connection structure and an adhesive film storage kit including the adhesive film.

以下,視情況參照圖式對本發明的實施形態進行詳細說明。再者,本說明書中,個別記載的上限值及下限值能夠任意地組合。另外,於本說明書中,所謂「(甲基)丙烯酸酯」是指丙烯酸酯及與其所對應的甲基丙烯酸酯的至少一者。「(甲基)丙烯醯基」等其他類似的表述亦同樣。Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings as appropriate. In this specification, the upper limit value and the lower limit value that are individually described can be arbitrarily combined. In the present specification, the "(meth) acrylate" means at least one of an acrylate and a corresponding methacrylate. The same applies to other similar expressions such as "(meth) acrylfluorenyl".

<電路連接用接著劑膜> 圖1為表示一實施形態的電路連接用接著劑膜的示意剖面圖。如圖1所示,電路連接用接著劑膜1(以下亦簡稱為「接著劑膜1」)包括第1接著劑層2、及積層於第1接著劑層2上的第2接著劑層3。第1接著劑層2含有導電粒子4。<Adhesive Film for Circuit Connection> FIG. 1 is a schematic cross-sectional view showing an adhesive film for circuit connection according to an embodiment. As shown in FIG. 1, the adhesive film 1 for circuit connection (hereinafter also referred to simply as “adhesive film 1”) includes a first adhesive layer 2 and a second adhesive layer 3 laminated on the first adhesive layer 2. . The first adhesive layer 2 contains conductive particles 4.

接著劑膜1中,導電粒子4分散於第1接著劑層2中。因此,接著劑膜1為具有各向異性導電性的各向異性導電性接著劑膜。接著劑膜1用於介於具有第1電極的第1電路構件、與具有第2電極的第2電路構件之間,將第1電路構件及所述第2電路構件熱壓接,而使第1電極及第2電極彼此電性連接。In the adhesive film 1, the conductive particles 4 are dispersed in the first adhesive layer 2. Therefore, the adhesive film 1 is an anisotropic conductive adhesive film having an anisotropic conductivity. The adhesive film 1 is used between the first circuit member having the first electrode and the second circuit member having the second electrode, and the first circuit member and the second circuit member are thermally compression-bonded so that the first circuit member The first electrode and the second electrode are electrically connected to each other.

本實施形態中,第2接著劑層3顯示最低熔融黏度Y的溫度Ty下的第1接著劑層2的熔融黏度X相對於第2接著劑層3的最低熔融黏度Y的比(X/Y)為10以上。因此,根據接著劑膜1,可獲得高溫高濕環境下(例如85℃、85%RH)難以產生電路構件與電路連接部之間的剝離的電路連接結構體。In this embodiment, the ratio of the melt viscosity X of the first adhesive layer 2 to the minimum melt viscosity Y of the second adhesive layer 3 (X / Y at the temperature Ty at which the second adhesive layer 3 shows the lowest melt viscosity Y) ) Is 10 or more. Therefore, according to the adhesive film 1, it is possible to obtain a circuit connection structure in which a peeling between a circuit member and a circuit connection portion is unlikely to occur in a high temperature and high humidity environment (for example, 85 ° C, 85% RH).

進而,根據接著劑膜1,可降低電路連接結構體的相向電極的連接電阻,並且於高溫高濕環境下(例如85℃、85%RH)亦可維持低連接電阻。即,根據接著劑膜1,可提升電路連接結構體的連接可靠性。可獲得此種效果的理由並不明確,本發明者等人推測以下兩方面起到有利作用。第1方面是由以下情況起到的有利作用,即,本實施形態中,接著劑膜1的熔融黏度的比(X/Y)為10以上,因而由第1接著劑層2將導電粒子4固定,抑制連接時導電粒子4的流動,結果,電極中的導電粒子4的捕捉效率提升。第2方面是由以下情況起到的有利作用,即,本實施形態中,接著劑膜1的熔融黏度的比(X/Y)為10以上,因而正式壓接時,與第2接著劑層3相比,第1接著劑層2的流動以更大程度受到抑制。例如170℃、5秒的短時間壓接中,通常的接著劑(例如兩層結構的接著劑)的情況下,同時進行所積層的兩層接著劑層的兩個層中的流動與硬化。此時,於接著劑層與電路構件的界面,構成該接著劑層的接著劑一邊流動一邊進行該接著劑的硬化,因而容易產生應變或內部應力。另一方面,本實施形態中,產生第2接著劑層3的流動與硬化,但幾乎不產生第1接著劑層2的流動與硬化。因此,難以於電路構件與第1接著劑層2之間產生應變或內部應力,推測可提升高溫高濕環境下的電路構件與電路連接部的密接性,作為結果,可提升連接可靠性。Furthermore, according to the adhesive film 1, the connection resistance of the opposing electrodes of the circuit connection structure can be reduced, and the connection resistance can be maintained low even in a high-temperature and high-humidity environment (for example, 85 ° C, 85% RH). That is, the adhesive film 1 can improve the connection reliability of the circuit connection structure. The reason why such an effect can be obtained is not clear, and the present inventors speculate that the following two aspects play an advantageous role. The first aspect is advantageous in that, in this embodiment, the ratio of the melt viscosity (X / Y) of the adhesive film 1 is 10 or more. Therefore, the conductive particles 4 are separated by the first adhesive layer 2. It is fixed to suppress the flow of the conductive particles 4 during connection, and as a result, the capture efficiency of the conductive particles 4 in the electrode is improved. The second aspect is an advantageous effect that, in this embodiment, the ratio of the melt viscosity (X / Y) of the adhesive film 1 is 10 or more. Therefore, when it is formally crimped, it is in contact with the second adhesive layer. 3, the flow of the first adhesive layer 2 is suppressed to a greater extent. For example, in a short-term pressure bonding at 170 ° C. for 5 seconds, in the case of a general adhesive (such as a two-layer adhesive), the two layers of the two laminated layers are simultaneously flowed and hardened. At this time, at the interface between the adhesive layer and the circuit member, the adhesive constituting the adhesive layer is hardened while the adhesive flows while flowing, so that strain or internal stress easily occurs. On the other hand, in this embodiment, the flow and hardening of the second adhesive layer 3 occur, but the flow and hardening of the first adhesive layer 2 hardly occur. Therefore, it is difficult to generate strain or internal stress between the circuit member and the first adhesive layer 2, and it is estimated that the adhesion between the circuit member and the circuit connection portion in a high-temperature and high-humidity environment can be improved. As a result, connection reliability can be improved.

另外,接著劑膜1有時於以形成於基材的其中一個表面上的帶有基材的接著劑膜的狀態切割為細寬後,捲繞於卷芯,藉此而以接著劑卷軸的形式保管及使用。對於該接著劑卷軸,要求具有良好的耐黏連性,即,當自接著劑卷軸輸出帶有基材的接著劑膜時,接著劑膜1不容易自基材剝落。然而,就現有的接著劑膜而言,於切割為寬度0.4 mm~1.0 mm左右的窄寬的情況下,可能難以獲得良好的耐黏連性。另一方面,本實施形態的接著劑膜1中,熔融黏度的比(X/Y)為10以上,因而可抑制第1接著劑層2與基材的貼附(黏連)。因此,藉由於第2接著劑層3的與第1接著劑層2為相反側的表面設置基材,於切割為如上所述的窄寬的情況下,亦有可獲得良好的耐黏連性的傾向。再者,耐黏連性例如可藉由將接著劑卷軸於30℃環境下放置24小時後確認是否可無問題地拉出的試驗而進行評價。In addition, the adhesive film 1 may be cut into a narrow width in a state of an adhesive film with a base material formed on one surface of the base material, and then wound around a winding core, whereby the Form storage and use. This adhesive reel is required to have good blocking resistance, that is, when an adhesive film with a substrate is output from the adhesive reel, the adhesive film 1 is not easily peeled from the substrate. However, in the case of the conventional adhesive film, when it is cut into a narrow width of about 0.4 mm to 1.0 mm, it may be difficult to obtain good blocking resistance. On the other hand, in the adhesive film 1 of this embodiment, the ratio (X / Y) of the melt viscosity is 10 or more, so that the adhesion (adhesion) between the first adhesive layer 2 and the substrate can be suppressed. Therefore, since the base material is provided on the surface of the second adhesive layer 3 on the opposite side to the first adhesive layer 2, even when cut to the narrow width as described above, good blocking resistance can be obtained. Propensity. The blocking resistance can be evaluated by, for example, a test of confirming whether or not the adhesive roll can be pulled out without any problem after leaving the adhesive reel in an environment of 30 ° C. for 24 hours.

就提升與電路構件的密接性的觀點而言,熔融黏度的比(X/Y)較佳為10以上,更佳為20以上,進而佳為50以上,特佳為100以上。就對電路構件的潤濕性的觀點而言,熔融黏度的比(X/Y)可為10000以下,亦可為5000以下,亦可為1000以下。就該些觀點而言,熔融黏度的比(X/Y)可為10~10000,亦可為20~5000,亦可為50~5000,亦可為100~1000。熔融黏度X及最低熔融黏度Y可藉由利用實施例中記載的方法來進行第1接著劑層2及第2接著劑層3的熔融黏度測定而求出。具體而言,首先,藉由第2接著劑層3的熔融黏度測定而求出第2黏著劑層3的最低熔融黏度Y(及第2接著劑層顯示最低熔融黏度Y的溫度Ty)後,藉由第1接著劑層2的熔融黏度測定而求出溫度Ty下的第1接著劑層2的熔融黏度X。再者,熔融黏度的測定亦可於獲得接著劑膜1後進行。From the viewpoint of improving the adhesion with the circuit member, the melt viscosity ratio (X / Y) is preferably 10 or more, more preferably 20 or more, still more preferably 50 or more, and particularly preferably 100 or more. From the viewpoint of wettability of the circuit member, the melt viscosity ratio (X / Y) may be 10,000 or less, may be 5,000 or less, and may be 1,000 or less. From these viewpoints, the ratio of melt viscosity (X / Y) may be 10 to 10,000, 20 to 5000, 50 to 5000, or 100 to 1,000. The melt viscosity X and the minimum melt viscosity Y can be obtained by measuring the melt viscosity of the first adhesive layer 2 and the second adhesive layer 3 by the method described in the examples. Specifically, first, the minimum melt viscosity Y of the second adhesive layer 3 (and the temperature Ty showing the minimum melt viscosity Y of the second adhesive layer) is determined by measuring the melt viscosity of the second adhesive layer 3, The melt viscosity X of the first adhesive layer 2 at the temperature Ty is determined by measuring the melt viscosity of the first adhesive layer 2. The measurement of the melt viscosity may be performed after the adhesive film 1 is obtained.

(第1接著劑層) 第1接著劑層2例如包含第1硬化性組成物的硬化物。第1硬化性組成物可為光硬化性組成物,亦可為熱硬化性組成物,亦可為光硬化性組成物及熱硬化性組成物的混合物。第1硬化性組成物例如含有(A)聚合性化合物(以下亦稱為「(A)成分」)、(B)聚合起始劑(以下亦稱為「(B)成分」)、及(C)導電粒子4(以下亦稱為「(C)成分」)。於第1硬化性組成物為光硬化性組成物的情況下,第1硬化性組成物含有光聚合起始劑作為(B)成分,於第1硬化性組成物為熱硬化性組成物的情況下,第1硬化性組成物含有熱聚合起始劑作為(B)成分。此種第1接著劑層2例如可藉由以下方式獲得:藉由對包含第1硬化性組成物的層進行光照射或加熱而使(A)成分聚合,使第1硬化性組成物硬化。即,第1接著劑層2可包含導電粒子4、及使第1硬化性組成物的導電粒子4以外的成分硬化而成的接著劑成分5。第1接著劑層2可為使第1硬化性組成物完全硬化而成的硬化物,亦可為使第1硬化性組成物部分硬化而成的硬化物。即,於第1硬化性組成物含有(A)成分及(B)成分的情況下,接著劑成分5可含有未反應的(A)成分及(B)成分,亦可不含。再者,第1接著劑層2亦可包含硬化性組成物的硬化物以外的樹脂組成物。例如,第1接著劑層可包含含有PKHC等苯氧基樹脂、聚酯胺基甲酸酯樹脂、聚胺基甲酸酯樹脂、丙烯酸橡膠等樹脂成分的樹脂組成物。藉由使用此種樹脂成分,可將第2接著劑層顯示最低熔融黏度的溫度(例如100℃)下的熔融黏度調整為100000 Pa·s~10000000 Pa·s左右,可將熔融黏度的比(X/Y)設為10以上。(First Adhesive Layer) The first adhesive layer 2 contains, for example, a cured product of a first curable composition. The first curable composition may be a photocurable composition, a thermosetting composition, or a mixture of a photocurable composition and a thermosetting composition. The first curable composition contains (A) a polymerizable compound (hereinafter also referred to as "(A) component"), (B) a polymerization initiator (hereinafter also referred to as "(B) component"), and (C ) Conductive particles 4 (hereinafter also referred to as "(C) component"). When the first curable composition is a photocurable composition, the first curable composition contains a photopolymerization initiator as the component (B), and when the first curable composition is a thermosetting composition Hereinafter, the first curable composition contains a thermal polymerization initiator as a component (B). Such a first adhesive layer 2 can be obtained, for example, by curing the first curable composition by polymerizing the component (A) by irradiating or heating the layer containing the first curable composition. That is, the first adhesive layer 2 may include conductive particles 4 and an adhesive component 5 obtained by hardening components other than the conductive particles 4 of the first curable composition. The first adhesive layer 2 may be a cured product obtained by completely curing the first curable composition, or may be a cured product obtained by partially curing the first curable composition. That is, when the (A) component and (B) component are contained in a 1st curable composition, the adhesive agent component 5 may contain unreacted (A) component and (B) component, and may not contain it. The first adhesive layer 2 may include a resin composition other than the cured product of the curable composition. For example, the first adhesive layer may include a resin composition containing resin components such as a phenoxy resin such as PKHC, a polyester urethane resin, a polyurethane resin, and an acrylic rubber. By using such a resin component, the melt viscosity at a temperature at which the second adhesive layer exhibits the lowest melt viscosity (for example, 100 ° C.) can be adjusted to about 100,000 Pa · s to 10000000 Pa · s, and the melt viscosity ratio ( X / Y) is set to 10 or more.

[(A)成分:聚合性化合物] (A)成分例如為藉由聚合起始劑(光聚合起始劑或熱聚合起始劑)因光(例如紫外光)的照射或加熱產生的自由基、陽離子或陰離子而聚合的化合物。(A)成分可為單體、寡聚物或聚合物的任一者。作為(A)成分,可單獨使用一種化合物,亦可組合使用多種化合物。[(A) Component: Polymerizable Compound] The (A) component is, for example, a radical generated by a polymerization initiator (photopolymerization initiator or thermal polymerization initiator) by irradiation with light (for example, ultraviolet light) or heating. , Cationic or anionic polymerized compounds. (A) A component may be any of a monomer, an oligomer, or a polymer. As the component (A), one kind of compound may be used alone, or a plurality of kinds of compounds may be used in combination.

(A)成分具有至少一個以上的聚合性基。聚合性基例如為包含聚合性不飽和雙鍵(乙烯性不飽和鍵)的基。就容易獲得所期望的熔融黏度的觀點、高溫高濕環境下不易產生電路構件與電路連接部之間的剝離的觀點、及連接電阻的降低效果進一步提升且連接可靠性更優異的觀點而言,聚合性基較佳為藉由自由基而進行反應的自由基聚合性基。即,(A)成分較佳為自由基聚合性化合物。作為自由基聚合性基,例如可列舉:乙烯基、烯丙基、苯乙烯基、烯基、伸烯基、(甲基)丙烯醯基、馬來醯亞胺基等。關於(A)成分所具有的聚合性基的數量,就聚合後容易獲得所期望的熔融黏度的觀點、高溫高濕環境下不易產生電路構件與電路連接部之間的剝離的觀點、及連接電阻的降低效果進一步提升且連接可靠性更優異的觀點而言,可為兩個以上,就抑制聚合時的硬化收縮的觀點而言,可為10以下。另外,為了取得交聯密度與硬化收縮的平衡,除使用聚合性基的數量為所述範圍內的聚合性化合物之外,可追加使用所述範圍外的聚合性化合物。The component (A) has at least one polymerizable group. The polymerizable group is, for example, a group containing a polymerizable unsaturated double bond (ethylene unsaturated bond). From the viewpoint of easily obtaining a desired melt viscosity, the viewpoint that peeling between a circuit member and a circuit connection portion is unlikely to occur in a high-temperature and high-humidity environment, and a viewpoint that the effect of reducing the connection resistance is further improved and the connection reliability is more excellent, The polymerizable group is preferably a radical polymerizable group that reacts with a radical. That is, the (A) component is preferably a radical polymerizable compound. Examples of the radical polymerizable group include a vinyl group, an allyl group, a styryl group, an alkenyl group, an alkenyl group, a (meth) acrylfluorenyl group, and a maleimide group. Regarding the number of polymerizable groups contained in the component (A), from the viewpoint of easily obtaining a desired melt viscosity after polymerization, the viewpoint that peeling between a circuit member and a circuit connection portion is unlikely to occur in a high-temperature and high-humidity environment, and connection resistance. From the viewpoint of further improving the effect of reducing the temperature and more excellent connection reliability, it may be two or more, and from the viewpoint of suppressing curing shrinkage during polymerization, it may be 10 or less. In addition, in order to achieve a balance between crosslinking density and curing shrinkage, in addition to using a polymerizable compound in which the number of polymerizable groups is within the above range, a polymerizable compound outside the above range may be additionally used.

作為(A)成分的具體例,可列舉:(甲基)丙烯酸酯化合物、馬來醯亞胺化合物、乙烯基醚化合物、烯丙基化合物、苯乙烯衍生物、丙烯醯胺衍生物、納迪克醯亞胺(nadiimide)衍生物、天然橡膠、異戊二烯橡膠、丁基橡膠、腈橡膠、丁二烯橡膠、苯乙烯-丁二烯橡膠、丙烯腈-丁二烯橡膠、羧基化腈橡膠等。Specific examples of the component (A) include a (meth) acrylate compound, a maleimide compound, a vinyl ether compound, an allyl compound, a styrene derivative, an acrylamide derivative, and Nadiq Nadiimide derivatives, natural rubber, isoprene rubber, butyl rubber, nitrile rubber, butadiene rubber, styrene-butadiene rubber, acrylonitrile-butadiene rubber, carboxylated nitrile rubber Wait.

作為(甲基)丙烯酸酯化合物,可列舉:環氧(甲基)丙烯酸酯、(聚)胺基甲酸酯(甲基)丙烯酸酯、(甲基)丙烯酸甲酯、聚醚(甲基)丙烯酸酯、聚酯(甲基)丙烯酸酯、聚丁二烯(甲基)丙烯酸酯、矽酮丙烯酸酯、(甲基)丙烯酸乙酯、(甲基)丙烯酸2-氰基乙酯、2-(2-乙氧基乙氧基)(甲基)丙烯酸乙酯、(甲基)丙烯酸2-乙氧基乙酯、(甲基)丙烯酸2-乙基己酯、(甲基)丙烯酸正己酯、(甲基)丙烯酸2-羥基乙酯、(甲基)丙烯酸異丙酯、(甲基)丙烯酸羥基丙酯、(甲基)丙烯酸異丁酯、(甲基)丙烯酸異冰片酯、(甲基)丙烯酸異癸酯、(甲基)丙烯酸異辛酯、(甲基)丙烯酸正月桂基酯、(甲基)丙烯酸2-甲氧基乙酯、(甲基)丙烯酸2-苯氧基乙酯、(甲基)丙烯酸四氫糠酯、磷酸2-(甲基)丙烯醯氧基乙酯、(甲基)丙烯酸N,N-二甲基胺基乙酯、(甲基)丙烯酸N,N-二甲基胺基丙酯、乙二醇二丙烯酸酯、二乙二醇二丙烯酸酯、三羥甲基丙烷三(甲基)丙烯酸酯、四羥甲基甲烷四(甲基)丙烯酸酯、聚乙二醇二(甲基)丙烯酸酯、聚烷二醇二(甲基)丙烯酸酯、(甲基)丙烯酸環己酯、(甲基)丙烯酸二環戊烯酯、(甲基)丙烯酸二環戊烯氧基乙酯、新戊二醇二(甲基)丙烯酸酯、季戊四醇(甲基)丙烯酸酯、二季戊四醇六(甲基)丙烯酸酯、異三聚氰酸改質二官能(甲基)丙烯酸酯、異三聚氰酸改質三官能(甲基)丙烯酸酯、三環癸基丙烯酸酯、二羥甲基-三環癸烷二丙烯酸酯、2-羥基-1,3-二丙烯醯氧基丙烷、2,2-雙[4-(丙烯醯氧基甲氧基)苯基]丙烷、2,2-雙[4-(丙烯醯氧基聚乙氧基)苯基]丙烷、2,2-二(甲基)丙烯醯氧基二乙基磷酸酯、2-(甲基)丙烯醯氧基乙基酸式磷酸酯等。Examples of the (meth) acrylate compound include epoxy (meth) acrylate, (poly) urethane (meth) acrylate, methyl (meth) acrylate, and polyether (meth) Acrylate, polyester (meth) acrylate, polybutadiene (meth) acrylate, silicone acrylate, ethyl (meth) acrylate, 2-cyanoethyl (meth) acrylate, 2- (2-ethoxyethoxy) ethyl (meth) acrylate, 2-ethoxyethyl (meth) acrylate, 2-ethylhexyl (meth) acrylate, n-hexyl (meth) acrylate , 2-hydroxyethyl (meth) acrylate, isopropyl (meth) acrylate, hydroxypropyl (meth) acrylate, isobutyl (meth) acrylate, isobornyl (meth) acrylate, (formyl) (Isopropyl) acrylate, isooctyl (meth) acrylate, n-lauryl (meth) acrylate, 2-methoxyethyl (meth) acrylate, 2-phenoxyethyl (meth) acrylate Ester, tetrahydrofurfuryl (meth) acrylate, 2- (meth) acryloxyethyl phosphate, N, N-dimethylaminoethyl (meth) acrylate, N (meth) acrylate, N-dimethylaminopropyl ester, ethylene glycol diacrylate, diethylene glycol diacrylate Acrylates, trimethylolpropane tri (meth) acrylate, tetramethylolmethane tetra (meth) acrylate, polyethylene glycol di (meth) acrylate, polyalkylene glycol di (methyl) ) Acrylate, cyclohexyl (meth) acrylate, dicyclopentenyl (meth) acrylate, dicyclopentenyloxyethyl (meth) acrylate, neopentyl glycol di (meth) acrylate, Pentaerythritol (meth) acrylate, dipentaerythritol hexa (meth) acrylate, isotricyanic acid modified difunctional (meth) acrylate, isotricyanic acid modified trifunctional (meth) acrylate, Tricyclodecyl acrylate, dimethylol-tricyclodecane diacrylate, 2-hydroxy-1,3-dipropenyloxypropane, 2,2-bis [4- (propenyloxymethoxy) Phenyl) phenyl] propane, 2,2-bis [4- (propenyloxypolyethoxy) phenyl] propane, 2,2-bis (meth) propenyloxydiethyl phosphate, 2 -(Meth) acryloxyethyl acid phosphate and the like.

作為馬來醯亞胺化合物,可列舉:1-甲基-2,4-雙馬來醯亞胺苯、N,N'-間苯雙馬來醯亞胺、N,N'-對苯雙馬來醯亞胺、N,N'-間甲苯雙馬來醯亞胺、N,N'-4,4-聯苯雙馬來醯亞胺、N,N'-4,4-(3,3'-二甲基-聯苯)雙馬來醯亞胺、N,N'-4,4-(3,3'-二甲基二苯基甲烷)雙馬來醯亞胺、N,N'-4,4-(3,3'-二乙基二苯基甲烷)雙馬來醯亞胺、N,N'-4,4-二苯基甲烷雙馬來醯亞胺、N,N'-4,4-二苯基丙烷雙馬來醯亞胺、N,N'-4,4-二苯基醚雙馬來醯亞胺、N,N'-3,3-二苯基碸雙馬來醯亞胺、2,2-雙(4-(4-馬來醯亞胺苯氧基)苯基)丙烷、2,2-雙(3-第二丁基-4-8(4-馬來醯亞胺苯氧基)苯基)丙烷、1,1-雙(4-(4-馬來醯亞胺苯氧基)苯基)癸烷、4,4'-亞環己基-雙(1-(4-馬來醯亞胺苯氧基)-2-環己基)苯、2,2'-雙(4-(4-馬來醯亞胺苯氧基)苯基)六氟丙烷等。Examples of maleimide compounds include 1-methyl-2,4-bismaleimide benzene, N, N'-m-phenylenemaleimide, and N, N'-p-phenylene Maleimide, N, N'-m-toluenebismaleimide, N, N'-4,4-biphenylbismaleimide, N, N'-4,4- (3, 3'-dimethyl-biphenyl) bismaleimide, N, N'-4,4- (3,3'-dimethyldiphenylmethane) bismaleimide, N, N '-4,4- (3,3'-Diethyldiphenylmethane) bismaleimide, N, N'-4,4-diphenylmethanebismaleimide, N, N '-4,4-Diphenylpropane bismaleimide, N, N'-4,4-diphenyl ether bismaleimide, N, N'-3,3-diphenyl fluorene Bismaleimide, 2,2-bis (4- (4-maleimidephenoxy) phenyl) propane, 2,2-bis (3-secondbutyl-4-8 (4 -Maleimide phenoxy) phenyl) propane, 1,1-bis (4- (4-maleimide phenoxy) phenyl) decane, 4,4'-cyclohexylene- Bis (1- (4-maleimidoimidophenoxy) -2-cyclohexyl) benzene, 2,2'-bis (4- (4-maleimidoimidophenoxy) phenyl) hexafluoro Propane and so on.

作為乙烯基醚化合物,可列舉:二乙二醇二乙烯基醚、二丙二醇二乙烯基醚、環己烷二甲醇二乙烯基醚、三羥甲基丙烷三乙烯基醚等。Examples of the vinyl ether compound include diethylene glycol divinyl ether, dipropylene glycol divinyl ether, cyclohexanedimethanol divinyl ether, and trimethylolpropane trivinyl ether.

作為烯丙基化合物,可列舉1,3-二烯丙基鄰苯二甲酸酯、1,2-二烯丙基鄰苯二甲酸酯、三烯丙基異氰脲酸酯等。Examples of the allyl compound include 1,3-diallyl phthalate, 1,2-diallyl phthalate, and triallyl isocyanurate.

就容易獲得所期望的熔融黏度的觀點、高溫高濕環境下不易產生電路構件與電路連接部之間的剝離的觀點、及連接電阻的降低效果進一步提升且連接可靠性更優異的觀點而言,(A)成分較佳為(甲基)丙烯酸酯化合物。就獲得更優異的所述接著特性的觀點而言,(A)成分可為(聚)胺基甲酸酯(甲基)丙烯酸酯化合物(胺基甲酸酯(甲基)丙烯酸酯化合物或聚胺基甲酸酯(甲基)丙烯酸酯化合物)。另外,就獲得更優異的所述接著特性的觀點而言,(A)成分可為具有二環戊二烯骨架等高Tg骨架的(甲基)丙烯酸酯化合物。From the viewpoint of easily obtaining a desired melt viscosity, the viewpoint that peeling between a circuit member and a circuit connection portion is unlikely to occur in a high-temperature and high-humidity environment, and a viewpoint that the effect of reducing the connection resistance is further improved and the connection reliability is more excellent, The (A) component is preferably a (meth) acrylate compound. The (A) component may be a (poly) urethane (meth) acrylate compound (urethane (meth) acrylate compound or poly (urethane) (Urethane (meth) acrylate compounds). Moreover, (A) component can be a (meth) acrylic acid ester compound which has a high Tg skeleton, such as a dicyclopentadiene skeleton, from a viewpoint of obtaining the said adhesive characteristic more excellent.

就容易獲得所期望的熔融黏度的觀點、高溫高濕環境下不易產生電路構件與電路連接部之間的剝離的觀點、及連接電阻的降低效果進一步提升且連接可靠性更優異的觀點而言,(A)成分可為於丙烯酸樹脂、苯氧基樹脂、聚胺基甲酸酯樹脂等熱塑性樹脂的末端或側鏈導入有乙烯基、烯丙基、(甲基)丙烯醯基等聚合性基的化合物(例如聚胺基甲酸酯(甲基)丙烯酸酯)。該情況下,就交聯密度與硬化收縮的平衡優異的觀點而言,(A)成分的重量平均分子量可為3000以上,亦可為5000以上,亦可為1萬以上。另外,就與其他成分的相容性優異的觀點而言,(A)成分的重量平均分子量可為100萬以下,亦可為50萬以下,亦可為25萬以下。再者,重量平均分子量是指依照實施例中記載的條件,藉由凝膠滲透層析儀(gel-permeation chromatograph,GPC)使用標準聚苯乙烯的校準曲線而測定出的值。From the viewpoint of easily obtaining a desired melt viscosity, the viewpoint that peeling between a circuit member and a circuit connection portion is unlikely to occur in a high-temperature and high-humidity environment, and a viewpoint that the effect of reducing the connection resistance is further improved and the connection reliability is more excellent, The component (A) may be a polymerizable group such as a vinyl group, an allyl group, or a (meth) acrylfluorenyl group introduced into a terminal or side chain of a thermoplastic resin such as an acrylic resin, a phenoxy resin, or a polyurethane resin. Compounds (such as polyurethane (meth) acrylates). In this case, the weight average molecular weight of the component (A) may be 3,000 or more, may be 5,000 or more, and may be 10,000 or more from the viewpoint of excellent balance between the crosslinking density and curing shrinkage. From the viewpoint of excellent compatibility with other components, the weight average molecular weight of the component (A) may be 1 million or less, may be 500,000 or less, or may be 250,000 or less. The weight average molecular weight refers to a value measured using a calibration curve of a standard polystyrene in accordance with conditions described in the examples using a gel-permeation chromatograph (GPC).

作為(甲基)丙烯酸酯化合物,(A)成分較佳為包含具有下述通式(1)所表示的磷酸酯結構的自由基聚合性化合物。該情況下,對於無機物(金屬等)的表面的接著強度提升,因此適於例如電極彼此(例如電路電極彼此)的接著。 [化1][式中,n表示1~3的整數,R表示氫原子或甲基]As the (meth) acrylate compound, the component (A) is preferably a radically polymerizable compound containing a phosphate ester structure represented by the following general formula (1). In this case, since the bonding strength to the surface of an inorganic substance (metal, etc.) is improved, it is suitable for bonding electrodes (for example, circuit electrodes) to each other. [Chemical 1] [Wherein n represents an integer of 1 to 3, and R represents a hydrogen atom or a methyl group]

所述具有磷酸酯結構的自由基聚合性化合物例如可藉由使無水磷酸與(甲基)丙烯酸-2-羥基乙酯反應而獲得。作為具有磷酸酯結構的自由基聚合性化合物的具體例,可列舉單(2-(甲基)丙烯醯氧基乙基)酸式磷酸酯、二(2-(甲基)丙烯醯氧基乙基)酸式磷酸酯等。The radically polymerizable compound having a phosphate ester structure can be obtained, for example, by reacting anhydrous phosphoric acid with 2-hydroxyethyl (meth) acrylate. Specific examples of the radically polymerizable compound having a phosphate ester structure include mono (2- (meth) acryloxyethyl) acid phosphate, and bis (2- (meth) acryloxyethyl) Group) acid phosphate and the like.

就容易獲得所期望的熔融黏度的觀點、高溫高濕環境下不易產生電路構件與電路連接部之間的剝離的觀點、及連接電阻的降低效果進一步提升且連接可靠性更優異的觀點而言,以第1硬化性組成物的總質量基準計,(A)成分的含量可為5質量%以上,亦可為10質量%以上,亦可為20質量%以上。就抑制聚合時的硬化收縮的觀點而言,以第1硬化性組成物的總質量基準計,(A)成分的含量可為90質量%以下,亦可為80質量%以下,亦可為70質量%以下。From the viewpoint of easily obtaining a desired melt viscosity, the viewpoint that peeling between a circuit member and a circuit connection portion is unlikely to occur in a high-temperature and high-humidity environment, and a viewpoint that the effect of reducing the connection resistance is further improved and the connection reliability is more excellent, The content of the component (A) may be 5 mass% or more, may be 10 mass% or more, and may be 20 mass% or more on the basis of the total mass of the first curable composition. From the viewpoint of suppressing curing shrinkage during polymerization, the content of the component (A) may be 90% by mass or less, or 80% by mass or less, or 70% based on the total mass of the first curable composition. Mass% or less.

[(B)成分:聚合起始劑] (B)成分可為藉由包含150 nm~750 nm的範圍內的波長的光、較佳為包含254 nm~405 nm的範圍內的波長的光、進而佳為包含365 nm的波長的光(例如紫外光)的照射而產生自由基、陽離子或陰離子的光聚合起始劑(光自由基聚合起始劑、光陽離子聚合起始劑或光陰離子聚合起始劑),亦可為藉由熱而產生自由基、陽離子或陰離子的熱聚合起始劑(熱自由基聚合起始劑、熱陽離子聚合起始劑或熱陰離子聚合起始劑)。就容易獲得所期望的熔融黏度的觀點、連接電阻的降低效果進一步提升且連接可靠性更優異的觀點、及低溫短時間下的硬化更容易的觀點而言,(B)成分較佳為自由基聚合起始劑(光自由基聚合起始劑或熱自由基聚合起始劑)。作為(B)成分,可單獨使用一種化合物,亦可組合使用多種化合物。例如,第1硬化性組成物亦可含有光聚合起始劑及熱聚合起始劑的兩者作為(B)成分。[(B) component: polymerization initiator] (B) component may be light containing a wavelength in a range of 150 to 750 nm, preferably light containing a wavelength in a range of 254 to 405 nm, A photopolymerization initiator (photoradical polymerization initiator, photocationic polymerization initiator, or photoanionic polymerization) that generates radicals, cations, or anions by irradiation with light having a wavelength of 365 nm (for example, ultraviolet light) is further preferred. Initiator), or a thermal polymerization initiator (thermal radical polymerization initiator, thermal cationic polymerization initiator, or thermal anionic polymerization initiator) that generates free radicals, cations, or anions by heat. From the viewpoint that it is easy to obtain a desired melt viscosity, that the effect of reducing the connection resistance is further improved, and that the connection reliability is more excellent, and from the viewpoint that the hardening at a low temperature and a short time is easier, the component (B) is preferably a radical Polymerization initiator (photo radical polymerization initiator or thermal radical polymerization initiator). As component (B), one compound may be used alone, or a plurality of compounds may be used in combination. For example, the first curable composition may contain both a photopolymerization initiator and a thermal polymerization initiator as the (B) component.

光自由基聚合起始劑藉由光而分解,從而產生游離自由基。即,光自由基聚合起始劑為藉由賦予來自外部的光能量而產生自由基的化合物。作為光自由基聚合起始劑,可列舉具有肟酯結構、聯咪唑結構、吖啶結構、α-胺基苯烷基酮結構、胺基二苯甲酮結構、N-苯基甘胺酸結構、醯基氧化膦結構、苯偶醯二甲基縮酮結構、α-羥基苯烷基酮結構等結構的化合物。就容易獲得所期望的熔融黏度的觀點、及連接電阻的降低效果更優異的觀點而言,光自由基聚合起始劑較佳為具有選自由肟酯結構、α-胺基苯烷基酮結構及醯基氧化膦結構所組成的群組中的至少一種結構。The photo radical polymerization initiator is decomposed by light to generate free radicals. That is, a photoradical polymerization initiator is a compound which generates a radical by giving light energy from the outside. Examples of the photo-radical polymerization initiator include an oxime ester structure, a biimidazole structure, an acridine structure, an α-aminobenzoyl ketone structure, an amine benzophenone structure, and an N-phenylglycine acid structure. Compounds having a fluorenylphosphine oxide structure, a benzophenone dimethyl ketal structure, and an α-hydroxybenzoalkyl ketone structure. From the viewpoint that the desired melt viscosity is easily obtained and the effect of reducing the connection resistance is more excellent, it is preferred that the photoradical polymerization initiator has a structure selected from the group consisting of an oxime ester structure and an α-aminobenzoyl ketone structure. And at least one structure in the group consisting of a fluorenyl phosphine oxide structure.

作為具有肟酯結構的化合物的具體例,可列舉:1-苯基-1,2-丁二酮-2-(鄰甲氧基羰基)肟、1-苯基-1,2-丙二酮-2-(鄰甲氧基羰基)肟、1-苯基-1,2-丙二酮-2-(鄰乙氧基羰基)肟、1-苯基-1,2-丙二酮-2-鄰苯甲醯基肟、1,3-二苯基丙三酮-2-(鄰乙氧基羰基)肟、1-苯基-3-乙氧基丙三酮-2-(鄰苯甲醯基)肟、1,2-辛二酮,1-[4-(苯硫基)苯基-,2-(鄰苯甲醯基肟)]、乙酮,1-[9-乙基-6-(2-甲基苯甲醯基)-9H-咔唑-3-基]-,1-(鄰乙醯基肟)等。Specific examples of the compound having an oxime ester structure include 1-phenyl-1,2-butanedione-2- (o-methoxycarbonyl) oxime and 1-phenyl-1,2-propanedione 2- (o-methoxycarbonyl) oxime, 1-phenyl-1,2-propanedione-2- (o-ethoxycarbonyl) oxime, 1-phenyl-1,2-propanedione-2 -O-Benzylhydrazine oxime, 1,3-diphenylglycerone-2- (o-ethoxycarbonyl) oxime, 1-phenyl-3-ethoxyglycerone-2- (o-benzoyl) Fluorenyl) oxime, 1,2-octanedione, 1- [4- (phenylthio) phenyl-, 2- (o-benzophenylideneoxime)], ethyl ketone, 1- [9-ethyl- 6- (2-methylbenzylidene) -9H-carbazol-3-yl]-, 1- (o-acetamidooxime) and the like.

作為具有α-胺基苯烷基酮結構的化合物的具體例,可列舉2-甲基-1-[4-(甲硫基)苯基]-2-嗎啉基丙烷-1-酮、2-苄基-2-二甲基胺基-1-嗎啉基苯基-丁酮-1等。Specific examples of the compound having an α-aminobenzoyl ketone structure include 2-methyl-1- [4- (methylthio) phenyl] -2-morpholinylpropane-1-one, 2 -Benzyl-2-dimethylamino-1-morpholinylphenyl-butanone-1 and the like.

作為具有醯基氧化膦結構的化合物的具體例,可列舉:雙(2,6-二甲氧基苯甲醯基)-2,4,4-三甲基-戊基氧化膦、雙(2,4,6-三甲基苯甲醯基)-苯基氧化膦、2,4,6-三甲基苯甲醯基-二苯基-氧化膦等。Specific examples of the compound having a fluorenylphosphine oxide structure include bis (2,6-dimethoxybenzylidene) -2,4,4-trimethyl-pentylphosphine oxide, and bis (2 , 4,6-trimethylbenzylidene) -phenylphosphine oxide, 2,4,6-trimethylbenzylidene-diphenyl-phosphine oxide, and the like.

熱自由基聚合起始劑藉由熱而分解,從而產生游離自由基。即,熱自由基聚合起始劑為藉由賦予來自外部的熱能量而產生自由基的化合物。作為熱自由基聚合起始劑,可自現有已知的有機過氧化物及偶氮化合物中任意地選擇。就穩定性、反應性及相容性的觀點而言,熱自由基聚合起始劑可較佳地使用一分鐘半衰期溫度為90℃~175℃且重量平均分子量為180~1000的有機過氧化物。藉由1分鐘半衰期溫度處於該範圍內,儲存穩定性更優異,自由基聚合性亦足夠高,能夠於短時間內硬化。The thermal radical polymerization initiator is decomposed by heat to generate free radicals. That is, a thermal radical polymerization initiator is a compound which generates a radical by giving thermal energy from the outside. The thermal radical polymerization initiator can be arbitrarily selected from conventionally known organic peroxides and azo compounds. From the viewpoints of stability, reactivity, and compatibility, an organic peroxide having a one-minute half-life temperature of 90 ° C to 175 ° C and a weight average molecular weight of 180 to 1,000 can be preferably used as the thermal radical polymerization initiator. . When the 1-minute half-life temperature is in this range, the storage stability is more excellent, and the radical polymerizability is also high enough to be hardened in a short time.

作為有機過氧化物的具體例,可列舉:過氧化新癸酸-1,1,3,3-四甲基丁酯、過氧化二碳酸二(4-第三丁基環己基)酯、過氧化二碳酸二(2-乙基己基)酯、過氧化新癸酸枯基酯、過氧化二月桂醯、過氧化新癸酸-1-環己基-1-甲基乙酯、過氧化新癸酸第三己酯、過氧化新癸酸第三丁酯、過氧化三甲基乙酸第三丁酯、過氧化-2-乙基己酸-1,1,3,3-四甲基丁酯、2,5-二甲基-2,5-二(2-乙基己醯基過氧化)己烷、過氧化-2-乙基己酸-第三己酯、過氧化-2-乙基己酸第三丁酯、過氧化新庚酸第三丁酯、過氧化-2-乙基己酸第三戊酯、過氧化六氫鄰苯二甲酸二-第三丁酯、過氧化-3,5,5-三甲基己酸第三戊酯、過氧化新癸酸-3-羥基-1,1-二甲基丁基酯、過氧化新癸酸第三戊酯、過氧化-2-乙基己酸第三戊酯、過氧化二(3-甲基苯甲醯)、過氧化二苯甲醯、過氧化二(4-甲基苯甲醯)、過氧化異丙基單碳酸第三己酯、過氧化馬來酸第三丁酯、過氧化-3,5,5-三甲基己酸第三丁酯、過氧化月桂酸第三丁酯、2,5-二甲基-2,5-二(3-甲基苯甲醯基過氧化)己烷、過氧化-2-乙基己基單碳酸第三丁酯、過氧化苯甲酸第三己酯、2,5-二甲基-2,5-二(苯甲醯基過氧化)己烷、過氧化苯甲酸第三丁酯、過氧化三甲基己二酸二丁酯、過氧化正辛酸第三戊酯、過氧化異壬酸第三戊酯、過氧化苯甲酸第三戊酯等。Specific examples of the organic peroxide include neodecanoic acid-1,1,3,3-tetramethylbutyl peroxy, bis (4-tert-butylcyclohexyl) peroxydicarbonate, and peroxydidecanoate. Di (2-ethylhexyl) dioxycarbonate, cumyl peroxyneodecanoate, dilauryl peroxide, neocyclodecyl peroxy-1-cyclohexyl-1-methylethyl ester, neodecyl peroxide Tert-hexyl acid, tert-butyl peroxydecanoate, tert-butyl peroxytrimethylacetate, 2-ethylhexanoate-1,1,3,3-tetramethylbutyl peroxy , 2,5-dimethyl-2,5-bis (2-ethylhexylperoxy) hexane, 2-ethylhexanoic acid-tertiary hexyl ester, 2-ethyl peroxide Tertiary butyl hexanoate, tertiary butyl perpeptanoate, tertiary pentyl peroxy-2-ethylhexanoate, di-tertiary butyl hexahydrophthalate, peroxy-3 , 3,5-Trimethylhexanoic acid third amyl ester, neodecanoic acid-3-hydroxy-1,1-dimethylbutyl ester, neodecanoic acid triamyl ester, peroxy-2 -Thirty-pentyl ethylhexanoate, bis (3-methylbenzidine) peroxide, bis (benzidine) peroxide, bis (4-methylbenzidine) peroxide, isopropyl monocarbonate First Trihexyl ester, tert-butyl peroxymaleate, tert-butyl peroxy-3,5,5-trimethylhexanoate, tert-butyl peroxylaurate, 2,5-dimethyl- 2,5-bis (3-methylbenzylideneperoxy) hexane, 2-ethylhexyl third ethyl butyl monocarbonate, third hexyl peroxybenzoate, 2,5-dimethyl -2,5-Di (benzylidene peroxy) hexane, tert-butyl peroxybenzoate, dibutyl peroxytrimethyl adipate, tert-amyl peroxyn-octanoate, peroxy Tert-amyl isononanoate, tert-amyl peroxybenzoate and the like.

作為偶氮化合物的具體例,可列舉:2,2'-偶氮雙-2,4-二甲基戊腈、1,1'-偶氮雙(1-乙醯氧基-1-苯基乙烷)、2,2'-偶氮雙異丁腈、2,2'-偶氮雙(2-甲基丁腈)、4,4'-偶氮雙(4-氰基戊酸)、1,1'-偶氮雙(1-環己烷甲腈)等。Specific examples of the azo compound include 2,2'-azobis-2,4-dimethylvaleronitrile, and 1,1'-azobis (1-acetamido-1-phenyl) Ethane), 2,2'-azobisisobutyronitrile, 2,2'-azobis (2-methylbutyronitrile), 4,4'-azobis (4-cyanovaleric acid), 1,1'-azobis (1-cyclohexanecarbonitrile) and the like.

就快速硬化性優異的觀點、及連接電阻的降低效果優異的觀點而言,以第1硬化性組成物的總質量基準計,(B)成分的含量可為0.1質量%以上,亦可為0.5質量%以上。就貯存穩定性提升的觀點、及連接電阻的降低效果優異的觀點而言,以第1硬化性組成物的總質量基準計,(B)成分的含量可為15質量%以下,亦可為10質量%以下,亦可為5質量%以下。From the viewpoint of excellent rapid hardening properties and the viewpoint of excellent connection resistance reduction effects, the content of the component (B) may be 0.1% by mass or more based on the total mass of the first curable composition, and may also be 0.5. Above mass%. From the viewpoint of improving the storage stability and the effect of reducing the connection resistance, the content of the (B) component may be 15% by mass or less based on the total mass of the first curable composition, and may also be 10 Mass% or less may be 5 mass% or less.

就容易獲得所期望的黏度的觀點而言,第1硬化性組成物較佳為含有光聚合起始劑及熱聚合起始劑中的至少一者作為(B)成分,就電路連接用接著劑膜的製造容易的觀點而言,第1硬化性組成物更佳為含有光聚合起始劑。From the viewpoint of easily obtaining a desired viscosity, the first curable composition preferably contains at least one of a photopolymerization initiator and a thermal polymerization initiator as the (B) component, and an adhesive for circuit connection. From the viewpoint that the production of the film is easy, the first curable composition more preferably contains a photopolymerization initiator.

[(C)成分:導電粒子] (C)成分若為具有導電性的粒子則並無特別限制,可為包含Au、Ag、Ni、Cu、焊料等金屬的金屬粒子;包含導電性碳的導電性碳粒子等。(C)成分亦可為包括核及被覆核的被覆層的被覆導電粒子,所述核包含非導電性的玻璃、陶瓷、塑膠(聚苯乙烯等)等,所述被覆層包含所述金屬或導電性碳。該些中,可較佳地使用包括如下核及被覆核的被覆層的被覆導電粒子,所述核包含由熱熔融性金屬形成的金屬粒子或塑膠,所述被覆層包含金屬或導電性碳。該情況下,容易藉由加熱或加壓而使第1硬化性組成物的硬化物變形,因此當將電極彼此電性連接時,可增加電極與(C)成分的接觸面積,而使電極間的導電性進一步提升。[(C) component: conductive particles] The (C) component is not particularly limited as long as it is conductive particles, and may be metal particles containing metals such as Au, Ag, Ni, Cu, and solder; conductive materials containing conductive carbon Carbon particles and so on. (C) The component may also be coated conductive particles including a core and a covering layer of a covering core, the core including non-conductive glass, ceramic, plastic (polystyrene, etc.), etc., the covering layer including the metal or Conductive carbon. Among these, coated conductive particles including a core including a metal particle or a plastic formed of a hot-melt metal, and a coating layer including a metal or conductive carbon can be preferably used. In this case, it is easy to deform the hardened material of the first hardenable composition by heating or pressing. Therefore, when the electrodes are electrically connected to each other, the contact area between the electrode and the (C) component can be increased to make the electrodes between the electrodes. The conductivity is further improved.

(C)成分可為包括所述金屬粒子、導電性碳粒子或被覆導電粒子以及絕緣層的絕緣被覆導電粒子,所述絕緣層包含樹脂等絕緣材料,且被覆該粒子的表面。若(C)成分為絕緣被覆導電粒子,則即便於(C)成分的含量多的情況下,亦會因粒子的表面被樹脂被覆而可抑制由(C)成分彼此的接觸引發短路,另外,亦可提升相鄰電極電路間的絕緣性。(C)成分可單獨使用以上所述的各種導電粒子的一種或組合使用兩種以上。The component (C) may be an insulating coated conductive particle including the metal particle, the conductive carbon particle, or the coated conductive particle, and an insulating layer that includes an insulating material such as a resin and covers the surface of the particle. If the (C) component is an insulating-coated conductive particle, even when the content of the (C) component is large, the surface of the particle is covered with a resin, so that short circuits caused by contact between the (C) components can be suppressed, and It also improves the insulation between adjacent electrode circuits. The component (C) may be used singly or in combination of two or more of the various conductive particles described above.

(C)成分的最大粒徑需要較電極的最小間隔(相鄰電極間的最短距離)更小。就分散性及導電性優異的觀點而言,(C)成分的最大粒徑可為1.0 μm以上,亦可為2.0 μm以上,亦可為2.5 μm以上。就分散性及導電性優異的觀點而言,(C)成分的最大粒徑可為50 μm以下,亦可為30 μm以下,亦可為20 μm以下。本說明書中,對任意的300個(pcs)導電粒子,藉由使用掃描式電子顯微鏡(Scanning Electron Microscope,SEM)的觀察進行粒徑的測定,將所獲得的最大值設為(C)成分的最大粒徑。再者,於(C)成分具有突起的情況等(C)成分並非球形的情況下,(C)成分的粒徑設為與SEM的圖像中的導電粒子外切的圓的直徑。(C) The maximum particle diameter of the component needs to be smaller than the minimum distance between electrodes (the shortest distance between adjacent electrodes). From the viewpoint of excellent dispersibility and electrical conductivity, the maximum particle diameter of the component (C) may be 1.0 μm or more, 2.0 μm or more, or 2.5 μm or more. From the viewpoint of excellent dispersibility and electrical conductivity, the maximum particle diameter of the component (C) may be 50 μm or less, 30 μm or less, or 20 μm or less. In this specification, the particle size of arbitrary 300 conductive particles (pcs) is measured by observation with a scanning electron microscope (SEM), and the maximum value obtained is defined as the (C) component. Maximum particle size. When the (C) component is not spherical, the particle size of the (C) component is set to the diameter of a circle circumscribed with the conductive particles in the SEM image.

就分散性及導電性優異的觀點而言,(C)成分的平均粒徑可為1.0 μm以上,亦可為2.0 μm以上,亦可為2.5 μm以上。就分散性及導電性優異的觀點而言,(C)成分的平均粒徑可為50 μm以下,亦可為30 μm以下,亦可為20 μm以下。本說明書中,對任意的300個(pcs)導電粒子,藉由使用掃描式電子顯微鏡(SEM)的觀察進行粒徑的測定,將所獲得的粒徑的平均值設為平均粒徑。From the viewpoint of excellent dispersibility and electrical conductivity, the average particle diameter of the component (C) may be 1.0 μm or more, 2.0 μm or more, or 2.5 μm or more. From the viewpoint of excellent dispersibility and electrical conductivity, the average particle diameter of the component (C) may be 50 μm or less, 30 μm or less, or 20 μm or less. In this specification, the particle size of arbitrary 300 conductive particles (pcs) is measured by observation with a scanning electron microscope (SEM), and the average value of the obtained particle diameters is the average particle diameter.

第1接著劑層2中,較佳為(C)成分均勻地分散。就可獲得穩定的連接電阻的觀點而言,第1接著劑層2中的(C)成分的粒子密度可為100 pcs/mm2 以上,亦可為1000 pcs/mm2 以上,亦可為2000 pcs/mm2 以上。就提升相鄰電極間的絕緣性的觀點而言,第1接著劑層2中的(C)成分的粒子密度可為100000 pcs/mm2 以下,亦可為50000 pcs/mm2 以下,亦可為10000 pcs/mm2 以下。In the first adhesive layer 2, it is preferable that the component (C) is uniformly dispersed. From the viewpoint of obtaining stable connection resistance, the particle density of the component (C) in the first adhesive layer 2 may be 100 pcs / mm 2 or more, or 1,000 pcs / mm 2 or more, and may be 2000. pcs / mm 2 or more. From the viewpoint of improving the insulation between adjacent electrodes, the particle density of the component (C) in the first adhesive layer 2 may be 100,000 pcs / mm 2 or less, or 50,000 pcs / mm 2 or less. It is below 10000 pcs / mm 2 .

就可進一步提升導電性的觀點而言,以第1接著劑層中的總體積基準計,(C)成分的含量可為0.1體積%以上,亦可為1體積%以上,亦可為5體積%以上。就容易抑制短路的觀點而言,以第1接著劑層中的總體積基準計,(C)成分的含量可為50體積%以下,亦可為30體積%以下,亦可為20體積%以下。再者,第1硬化性組成物中的(C)成分的含量(以第1硬化性組成物的總體積為基準)可與所述範圍相同。From the viewpoint of further improving the conductivity, the content of the component (C) may be 0.1% by volume or more, or 1% by volume or more, based on the total volume of the first adhesive layer. %the above. From the viewpoint of easily suppressing short circuits, the content of the component (C) may be 50% by volume or less, 30% by volume or less, and 20% by volume or less based on the total volume of the first adhesive layer. . The content of the (C) component in the first curable composition (based on the total volume of the first curable composition) may be the same as the above range.

[其他成分] 第1硬化性組成物可更含有(A)成分、(B)成分及(C)成分以外的其他成分。作為其他成分,例如可列舉熱塑性樹脂、偶合劑及填充材。該些成分亦可含有於第1接著劑層2中。[Other Components] The first curable composition may further contain components other than (A) component, (B) component, and (C) component. Examples of the other components include a thermoplastic resin, a coupling agent, and a filler. These components may be contained in the first adhesive layer 2.

作為熱塑性樹脂,例如可列舉:苯氧基樹脂、聚酯樹脂、聚醯胺樹脂、聚胺基甲酸酯樹脂、聚酯胺基甲酸酯樹脂、丙烯酸橡膠等。於第1硬化性組成物含有熱塑性樹脂的情況下,可容易地形成第1接著劑層。另外,於第1硬化性組成物含有熱塑性樹脂的情況下,可緩和第1硬化性組成物的硬化時產生的第1接著劑層的應力。另外,於熱塑性樹脂具有羥基等官能基的情況下,第1接著劑層的接著性容易提升。關於熱塑性樹脂的含量,例如以第1硬化性組成物的總質量基準計,可為5質量%以上,且可為80質量%以下。Examples of the thermoplastic resin include a phenoxy resin, a polyester resin, a polyamide resin, a polyurethane resin, a polyester urethane resin, and an acrylic rubber. When the first curable composition contains a thermoplastic resin, the first adhesive layer can be easily formed. In addition, when the first curable composition contains a thermoplastic resin, the stress of the first adhesive layer generated when the first curable composition is cured can be alleviated. Moreover, when a thermoplastic resin has a functional group, such as a hydroxyl group, the adhesiveness of a 1st adhesive layer is easy to improve. The content of the thermoplastic resin may be, for example, 5% by mass or more and 80% by mass or less based on the total mass of the first curable composition.

作為偶合劑,可列舉具有(甲基)丙烯醯基、巰基、胺基、咪唑基、環氧基等有機官能基的矽烷偶合劑;四烷氧基矽烷等矽烷化合物;四烷氧基鈦酸酯衍生物、聚二烷基鈦酸酯衍生物等。於第1硬化性組成物含有偶合劑的情況下,可進一步提升接著性。關於偶合劑的含量,例如以第1硬化性組成物的總質量基準計,可為0.1質量%以上,且可為20質量%以下。Examples of the coupling agent include a silane coupling agent having an organic functional group such as a (meth) acrylfluorenyl group, a mercapto group, an amine group, an imidazolyl group, or an epoxy group; a silane compound such as a tetraalkoxysilane; and a tetraalkoxytitanic acid Ester derivatives, polydialkyl titanate derivatives, and the like. When the first curable composition contains a coupling agent, the adhesiveness can be further improved. The content of the coupling agent may be, for example, 0.1% by mass or more and 20% by mass or less based on the total mass of the first curable composition.

作為填充材,例如可列舉非導電性的填料(例如非導電粒子)。於第1硬化性組成物含有填充材的情況下,可進而期待連接可靠性的提升。填充材可為無機填料及有機填料的任一者。作為無機填料,例如可列舉二氧化矽微粒子、氧化鋁微粒子、二氧化矽-氧化鋁微粒子、二氧化鈦微粒子、氧化鋯微粒子等金屬氧化物微粒子;氮化物微粒子等無機微粒子。作為有機填料,例如可列舉矽酮微粒子、甲基丙烯酸酯-丁二烯-苯乙烯微粒子、丙烯酸-矽酮微粒子、聚醯胺微粒子、聚醯亞胺微粒子等有機微粒子。該些微粒子可具有均勻的結構,亦可具有核-殼型結構。填充材的最大直徑較佳為小於導電粒子4的最小粒徑。關於填充材的含量,例如以第1硬化性組成物的總體積為基準,可為0.1體積%以上,且可為50體積%以下。Examples of the filler include non-conductive fillers (for example, non-conductive particles). When the first curable composition contains a filler, further improvement in connection reliability can be expected. The filler may be either an inorganic filler or an organic filler. Examples of the inorganic filler include metal oxide particles such as silica particles, alumina particles, silica-alumina particles, titania particles, and zirconia particles; and inorganic particles such as nitride particles. Examples of the organic filler include organic fine particles such as silicone fine particles, methacrylate-butadiene-styrene fine particles, acrylic-silicone fine particles, polyamide fine particles, and polyimide fine particles. These fine particles may have a uniform structure or may have a core-shell type structure. The maximum diameter of the filler is preferably smaller than the minimum particle diameter of the conductive particles 4. The content of the filler may be, for example, 0.1% by volume or more and 50% by volume or less based on the total volume of the first curable composition.

第1硬化性組成物亦可含有軟化劑、促進劑、劣化抑制劑、著色劑、阻燃劑、觸變劑等其他添加劑。以第1硬化性組成物的總質量基準計,該些添加劑的含量例如可為0.1質量%~10質量%。該些添加劑亦可含有於第1接著劑層2中。The first curable composition may contain other additives such as a softener, an accelerator, a deterioration inhibitor, a colorant, a flame retardant, and a thixotropic agent. The content of these additives may be, for example, 0.1% by mass to 10% by mass based on the total mass of the first curable composition. These additives may be contained in the first adhesive layer 2.

第1硬化性組成物亦可含有熱硬化性樹脂來代替(A)成分及(B)成分,或者在(A)成分及(B)成分之外含有熱硬化性樹脂。熱硬化性樹脂為藉由熱而硬化的樹脂,具有至少一個以上的熱硬化性基。熱硬化性樹脂例如為藉由熱而與硬化劑反應並因此而進行交聯的化合物。作為熱硬化性樹脂,可單獨使用一種化合物,亦可組合使用多種化合物。The first curable composition may contain a thermosetting resin instead of the components (A) and (B), or may contain a thermosetting resin in addition to the components (A) and (B). The thermosetting resin is a resin that is cured by heat, and has at least one thermosetting group. The thermosetting resin is, for example, a compound that reacts with a curing agent by heat and crosslinks it accordingly. As the thermosetting resin, one compound may be used alone, or a plurality of compounds may be used in combination.

就容易獲得所期望的熔融黏度的觀點、及連接電阻的降低效果進一步提升且連接可靠性更優異的觀點而言,熱硬化性基例如可為環氧基、氧雜環丁烷基、異氰酸酯基等。The thermosetting group may be, for example, an epoxy group, an oxetanyl group, or an isocyanate group from the viewpoint that a desired melt viscosity is easily obtained, and the effect of reducing the connection resistance is further improved and the connection reliability is more excellent. Wait.

作為熱硬化性樹脂的具體例,可列舉作為表氯醇與雙酚A、雙酚F、雙酚AD等的反應產物的雙酚型環氧樹脂;作為表氯醇與苯酚酚醛清漆、甲酚酚醛清漆等的反應產物的環氧酚醛清漆樹脂;具有含萘環的骨架的萘系環氧樹脂;縮水甘油胺、縮水甘油醚等一分子內具有兩個以上的縮水甘油基的各種環氧化合物等環氧樹脂。Specific examples of the thermosetting resin include bisphenol-type epoxy resins that are reaction products of epichlorohydrin and bisphenol A, bisphenol F, bisphenol AD, and the like; and epichlorohydrin, phenol novolac, and cresol Epoxy novolac resins of reaction products such as novolac; naphthalene-based epoxy resins having a naphthalene ring-containing skeleton; various epoxy compounds having two or more glycidyl groups in one molecule such as glycidylamine and glycidyl ether And so on.

於使用熱硬化性樹脂來代替(A)成分及(B)成分的情況下,例如以第1硬化性組成物的總質量為基準,第1硬化性組成物中的熱硬化性樹脂的含量可為20質量%以上,且可為80質量%以下。於在(A)成分及(B)成分之外使用熱硬化性樹脂的情況下,例如以第1硬化性組成物的總質量為基準,第1硬化性組成物中的熱硬化性樹脂的含量可為30質量%以上,且可為70質量%以下。When a thermosetting resin is used in place of the components (A) and (B), for example, based on the total mass of the first curable composition, the content of the thermosetting resin in the first curable composition may be It is 20% by mass or more, and may be 80% by mass or less. When using a thermosetting resin other than (A) component and (B) component, for example, content of the thermosetting resin in a 1st curable composition is based on the total mass of a 1st curable composition. It may be 30% by mass or more, and may be 70% by mass or less.

於第1硬化性組成物含有熱硬化性樹脂的情況下,第1硬化性組成物亦可含有以上所述的熱硬化性樹脂的硬化劑。作為熱硬化性樹脂的硬化劑,例如可列舉熱自由基產生劑、熱陽離子產生劑、熱陰離子產生劑等。關於硬化劑的含量,例如相對於熱硬化性樹脂100質量份,可為0.1質量份以上,且可為20質量份以下。When the first curable composition contains a thermosetting resin, the first curable composition may also contain a curing agent for the thermosetting resin described above. Examples of the curing agent of the thermosetting resin include a thermal radical generator, a thermal cation generator, and a thermal anion generator. The content of the hardener may be, for example, 0.1 part by mass or more and 20 parts by mass or less with respect to 100 parts by mass of the thermosetting resin.

第1接著劑層2亦可包含未反應的(A)成分、(B)成分等源自第1硬化性組成物的成分。推測:當將本實施形態的接著劑膜1收容於現有的收容構件來進行保管及搬運的情況下,於第1接著劑層2中殘留未反應的(B)成分,因而於保管中及搬運中,第2接著劑層3中的第2硬化性組成物的一部分硬化,產生於高溫高濕環境下容易產生電路構件與電路連接部之間的剝離、接著劑膜1的連接電阻的降低效果減小等不良狀況。因此,就可抑制所述不良狀況的產生的觀點而言,以第1接著劑層的總質量為基準,第1接著劑層2中的(B)成分的含量可為15質量%以下,亦可為10質量%以下,亦可為5質量%以下。以第1接著劑層的總質量為基準,第1接著劑層2中的(B)成分的含量可為0.1質量%以上。再者,於第1接著劑層2包含光聚合起始劑作為(B)成分的情況下,藉由將接著劑膜1收容至後述的收容構件,而可抑制所述不良狀況的產生。The first adhesive layer 2 may contain components derived from the first curable composition such as unreacted component (A) and component (B). It is presumed that when the adhesive film 1 of this embodiment is stored in an existing storage member for storage and transportation, the unreacted (B) component remains in the first adhesive layer 2 and is therefore stored and transported. In part, a part of the second curable composition in the second adhesive layer 3 is hardened, and the peeling between the circuit member and the circuit connection portion easily occurs in a high-temperature and high-humidity environment, and the connection resistance of the adhesive film 1 is reduced Reduction of other adverse conditions. Therefore, from the viewpoint of suppressing the occurrence of the above-mentioned problems, based on the total mass of the first adhesive layer, the content of the component (B) in the first adhesive layer 2 may be 15% by mass or less. It may be 10 mass% or less, and may be 5 mass% or less. The content of the component (B) in the first adhesive layer 2 may be 0.1% by mass or more based on the total mass of the first adhesive layer. When the first adhesive layer 2 includes a photopolymerization initiator as the component (B), the adhesive film 1 can be stored in a storage member described later to prevent the occurrence of the above-mentioned problems.

就更不易產生剝離的觀點而言,第2接著劑層3顯示最低熔融黏度Y的溫度Ty下的第1接著劑層2的熔融黏度X可為1000 Pa·s以上,亦可為10000 Pa·s以上,亦可為50000 Pa·s以上。就對基板的潤濕性優異的觀點而言,熔融黏度X可為10000000 Pa·s以下,亦可為1000000 Pa·s以下,亦可為500000 Pa·s以下。熔融黏度X可藉由變更第1硬化性組成物的組成、變更第1硬化性組成物的硬化條件等而進行調整。From the standpoint that peeling is less likely to occur, the melt viscosity X of the first adhesive layer 2 at a temperature Ty at which the second adhesive layer 3 exhibits the lowest melt viscosity Y may be 1,000 Pa · s or more, and may also be 10,000 Pa · s or more may be 50,000 Pa · s or more. From the viewpoint of excellent wettability to the substrate, the melt viscosity X may be 10,000,000 Pa · s or less, or 1,000,000 Pa · s or less, or 500,000 Pa · s or less. The melt viscosity X can be adjusted by changing the composition of the first curable composition, changing the curing conditions of the first curable composition, and the like.

就容易在電極間捕捉導電粒子4而可進一步降低連接電阻的觀點而言,第1接著劑層2的厚度d1可為導電粒子4的平均粒徑的0.2倍以上,亦可為0.3倍以上。就當熱壓接時導電粒子夾入相向的電極間時,導電粒子更容易破碎而可進一步降低連接電阻的觀點而言,第1接著劑層2的厚度d1可為導電粒子4的平均粒徑的0.8倍以下,亦可為0.7倍以下。就該些觀點而言,第1接著劑層2的厚度d1可為導電粒子4的平均粒徑的0.2倍~0.8倍,亦可為0.3倍~0.7倍。於第1接著劑層2的厚度d1與導電粒子4的平均粒徑滿足如上所述的關係的情況下,例如,如圖1所示,第1接著劑層2中的導電粒子4的一部分可自第1接著劑層2突出至第2接著劑層3側。該情況下,第1接著劑層2與第2接著劑層3的邊界S位於相鄰的導電粒子4、導電粒子4的隔開部分。導電粒子4可不在第1接著劑層2的與第2接著劑層3側為相反側的表面2a露出,相反側的表面2a為平坦面。The thickness d1 of the first adhesive layer 2 may be 0.2 times or more the average particle diameter of the conductive particles 4 or 0.3 times or more from the viewpoint that the conductive particles 4 are easily captured between the electrodes and the connection resistance can be further reduced. From the viewpoint that when conductive particles are sandwiched between opposing electrodes during thermocompression, the conductive particles are more easily broken and the connection resistance can be further reduced, the thickness d1 of the first adhesive layer 2 may be the average particle diameter of the conductive particles 4 0.8 times or less, and 0.7 times or less. From these viewpoints, the thickness d1 of the first adhesive layer 2 may be 0.2 to 0.8 times or 0.3 to 0.7 times the average particle diameter of the conductive particles 4. In a case where the thickness d1 of the first adhesive layer 2 and the average particle diameter of the conductive particles 4 satisfy the relationship described above, for example, as shown in FIG. 1, a part of the conductive particles 4 in the first adhesive layer 2 may be It protrudes from the 1st adhesive layer 2 to the 2nd adhesive layer 3 side. In this case, the boundary S between the first adhesive layer 2 and the second adhesive layer 3 is located at a spaced portion between the adjacent conductive particles 4 and the conductive particles 4. The conductive particles 4 may not be exposed on the surface 2 a on the opposite side of the first adhesive layer 2 from the second adhesive layer 3 side, and the surface 2 a on the opposite side may be a flat surface.

第1接著劑層2的厚度d1可根據所接著的電路構件的電極高度等而適當設定。第1接著劑層2的厚度d1例如可為0.5 μm以上,且可為20 μm以下。再者,於導電粒子4的一部分自第1接著劑層2的表面露出(例如突出至第2接著劑層3側)的情況下,自第1接著劑層2的與第2接著劑層3側為相反側的表面2a至位於相鄰的導電粒子4、導電粒子4的隔開部分的第1接著劑層2與第2接著劑層3的邊界S為止的距離(圖1中以d1表示的距離)為第1接著劑層2的厚度,導電粒子4的露出部分不包含於第1接著劑層2的厚度中。導電粒子4的露出部分的長度例如可為0.1 μm以上,且可為20 μm以下。The thickness d1 of the first adhesive layer 2 can be appropriately set according to the electrode height and the like of the circuit member to be attached. The thickness d1 of the first adhesive layer 2 may be, for example, 0.5 μm or more, and may be 20 μm or less. When a part of the conductive particles 4 is exposed from the surface of the first adhesive layer 2 (for example, it protrudes to the second adhesive layer 3 side), the first adhesive layer 2 and the second adhesive layer 3 are exposed. The distance from the surface 2a on the opposite side to the boundary S between the first adhesive layer 2 and the second adhesive layer 3 located in the adjacent conductive particles 4 and the separated portions of the conductive particles 4 (indicated by d1 in FIG. 1) Distance) is the thickness of the first adhesive layer 2, and the exposed portion of the conductive particles 4 is not included in the thickness of the first adhesive layer 2. The length of the exposed portion of the conductive particles 4 may be, for example, 0.1 μm or more, and may be 20 μm or less.

(第2接著劑層) 第2接著劑層3例如包含第2硬化性組成物。第2硬化性組成物例如含有(a)聚合性化合物(以下亦稱為(a)成分)及(b)聚合起始劑(以下亦稱為(b)成分)。第2硬化性組成物可為含有熱聚合起始劑作為(b)成分的熱硬化性組成物,亦可為含有光聚合起始劑作為(b)成分的光硬化性組成物,亦可為熱硬化性組成物及光硬化性組成物的混合物。構成第2接著劑層3的第2硬化性組成物為電路連接時能夠流動的未硬化的硬化性組成物,例如為未硬化的硬化性組成物。(Second Adhesive Layer) The second adhesive layer 3 contains, for example, a second curable composition. The second curable composition contains, for example, (a) a polymerizable compound (hereinafter also referred to as (a) component) and (b) a polymerization initiator (hereinafter also referred to as (b) component). The second curable composition may be a thermosetting composition containing a thermal polymerization initiator as component (b), or a photocurable composition containing a photopolymerization initiator as component (b), or may be A mixture of a thermosetting composition and a photocurable composition. The second curable composition constituting the second adhesive layer 3 is an uncured curable composition that can flow during circuit connection, and is, for example, an uncured curable composition.

[(a)成分:聚合性化合物] (a)成分例如為藉由聚合起始劑(光聚合起始劑或熱聚合起始劑)因光(例如紫外光)的照射或加熱產生的自由基、陽離子或陰離子而聚合的化合物。作為(a)成分,可使用作為(A)成分而例示的化合物。就低溫短時間下的連接容易、容易獲得所期望的熔融黏度的觀點、及連接電阻的降低效果進一步提升且連接可靠性更優異的觀點而言,(a)成分較佳為具有藉由自由基而反應的自由基聚合性基的自由基聚合性化合物。(a)成分中的較佳自由基聚合性化合物的例子及較佳自由基聚合性化合物的組合與(A)成分相同。於(a)成分為自由基聚合性化合物且第1接著劑層中的(B)成分為光自由基聚合起始劑的情況下,藉由將接著劑膜收容於後述的收容構件,而有顯著抑制接著劑膜的保管時或搬運時的第2硬化性組成物的硬化的傾向。[(A) component: polymerizable compound] (a) component is, for example, a radical generated by a polymerization initiator (photopolymerization initiator or thermal polymerization initiator) by irradiation with light (for example, ultraviolet light) or heating. , Cationic or anionic polymerized compounds. As (a) component, the compound exemplified as (A) component can be used. From the viewpoints of easy connection at low temperature and short time, easy to obtain desired melt viscosity, and further improvement of connection resistance reduction effect and more excellent connection reliability, the component (a) preferably has a free radical A radically polymerizable compound that reacts with a radically polymerizable group. Examples of preferable radical polymerizable compounds in the component (a) and combinations of preferable radical polymerizable compounds are the same as the component (A). When the component (a) is a radical polymerizable compound and the component (B) in the first adhesive layer is a photoradical polymerization initiator, the adhesive film is stored in a storage member described later, and there is The tendency of the second curable composition to harden during storage or transportation of the adhesive film is significantly suppressed.

(a)成分可為單體、寡聚物或聚合物的任一者。作為(a)成分,可單獨使用一種化合物,亦可組合使用多種化合物。(a)成分可與(A)成分相同亦可不同。(A) A component may be any of a monomer, an oligomer, or a polymer. As component (a), a single compound may be used alone, or a plurality of compounds may be used in combination. The component (a) may be the same as or different from the component (A).

就容易獲得用以降低連接電阻、提升連接可靠性而所需的交聯密度的觀點而言,以第2硬化性組成物的總質量基準計,(a)成分的含量可為10質量%以上,亦可為20質量%以上,亦可為30質量%以上。就抑制聚合時的硬化收縮,可獲得良好的可靠性的觀點而言,以第2硬化性組成物的總質量基準計,(a)成分的含量可為90質量%以下,亦可為80質量%以下,亦可為70質量%以下。From the viewpoint of easily obtaining a crosslink density required to reduce connection resistance and improve connection reliability, the content of (a) component may be 10% by mass or more based on the total mass of the second curable composition. It may be 20% by mass or more, and may also be 30% by mass or more. From the viewpoint of suppressing curing shrinkage during polymerization and obtaining good reliability, the content of the component (a) may be 90% by mass or less based on the total mass of the second curable composition, and may also be 80% by mass. % Or less, or 70% by mass or less.

[(b)成分:聚合起始劑] 作為(b)成分,可使用與作為(B)成分而例示的聚合起始劑相同的聚合起始劑。(b)成分較佳為自由基聚合起始劑。(b)成分中的較佳自由基聚合起始劑的例子與(B)成分相同。作為(b)成分,可單獨使用一種化合物,亦可組合使用多種化合物。[Component (b): Polymerization Initiator] As the component (b), the same polymerization initiator as the polymerization initiator exemplified as the component (B) can be used. The component (b) is preferably a radical polymerization initiator. Examples of the preferable radical polymerization initiator in the component (b) are the same as the component (B). As component (b), a single compound may be used alone, or a plurality of compounds may be used in combination.

就低溫短時間下的連接變容易的觀點、及連接可靠性更優異的觀點而言,以第2硬化性組成物的總質量基準計,(b)成分的含量可為0.1質量%以上,亦可為0.5質量%以上,亦可為1質量%以上。就適用期(pot life)的觀點而言,以第2硬化性組成物的總質量基準計,(b)成分的含量可為30質量%以下,亦可為20質量%以下,亦可為10質量%以下。From the viewpoint of easier connection at a low temperature for a short time, and a viewpoint of more excellent connection reliability, the content of the component (b) may be 0.1% by mass or more based on the total mass of the second curable composition. It may be 0.5 mass% or more, and may be 1 mass% or more. From the standpoint of pot life, the content of the component (b) may be 30% by mass or less, or 20% by mass or less, based on the total mass of the second curable composition. Mass% or less.

[其他成分] 第2硬化性組成物可更含有(a)成分及(b)成分以外的其他成分。作為其他成分,例如可列舉熱塑性樹脂、偶合劑、填充材、軟化劑、促進劑、劣化抑制劑、著色劑、阻燃劑、觸變劑等。其他成分的詳細情況與第1接著劑層2中的其他成分的詳細情況相同。[Other Components] The second curable composition may further contain components other than (a) component and (b) component. Examples of the other components include thermoplastic resins, coupling agents, fillers, softeners, accelerators, deterioration inhibitors, colorants, flame retardants, and thixotropic agents. The details of the other components are the same as those of the other components in the first adhesive layer 2.

第2硬化性組成物亦可含有熱硬化性樹脂來代替(a)成分及(b)成分,或者在(a)成分及(b)成分之外含有熱硬化性樹脂。於第2硬化性組成物含有熱硬化性樹脂的情況下,第2硬化性組成物亦可含有用於將熱硬化性樹脂硬化的硬化劑。作為熱硬化性樹脂及硬化劑,可使用與作為第1硬化性組成物中的其他成分所例示的熱硬化性樹脂及硬化劑相同的熱硬化性樹脂及硬化劑。於使用熱硬化性樹脂來代替(a)成分及(b)成分的情況下,例如以第2硬化性組成物的總質量為基準,第2硬化性組成物中的熱硬化性樹脂的含量可為20質量%以上,且可為80質量%以下。於在(a)成分及(b)成分之外使用熱硬化性樹脂的情況下,例如以第2硬化性組成物的總質量為基準,第2硬化性組成物中的熱硬化性樹脂的含量可為20質量%以上,且可為80質量%以下。硬化劑的含量可與作為第1硬化性組成物中的硬化劑的含量所記載的範圍相同。The second curable composition may contain a thermosetting resin instead of the components (a) and (b), or may contain a thermosetting resin in addition to the components (a) and (b). When the second curable composition contains a thermosetting resin, the second curable composition may contain a curing agent for curing the thermosetting resin. As the thermosetting resin and curing agent, the same thermosetting resin and curing agent as the thermosetting resin and curing agent exemplified as the other components in the first curable composition can be used. When a thermosetting resin is used instead of the components (a) and (b), for example, based on the total mass of the second curable composition, the content of the thermosetting resin in the second curable composition may be It is 20% by mass or more, and may be 80% by mass or less. When using a thermosetting resin other than (a) component and (b) component, for example, content of the thermosetting resin in a 2nd curable composition is based on the total mass of a 2nd curable composition. It may be 20% by mass or more and 80% by mass or less. The content of the curing agent may be the same as the range described as the content of the curing agent in the first curable composition.

關於第2接著劑層3中的導電粒子4的含量,例如以第2接著劑層的總質量基準計,可為1質量%以下,亦可為0質量%。第2接著劑層3較佳為不含導電粒子4。The content of the conductive particles 4 in the second adhesive layer 3 may be, for example, 1% by mass or less based on the total mass of the second adhesive layer, and may also be 0% by mass. The second adhesive layer 3 is preferably free of conductive particles 4.

就可獲得優異的耐黏連性的觀點而言,第2接著劑層3的最低熔融黏度Y可為50 Pa·s以上,亦可為100 Pa·s以上,亦可為300 Pa·s以上。就可獲得優異的電極間的填充性(樹脂填充性)的觀點而言,最低熔融黏度Y可為100000 Pa·s以下,亦可為10000 Pa·s以下,亦可為5000 Pa·s以下。最低熔融黏度Y可藉由變更第2硬化性組成物的組成等而進行調整。From the viewpoint of obtaining excellent blocking resistance, the minimum melt viscosity Y of the second adhesive layer 3 may be 50 Pa · s or higher, 100 Pa · s or higher, or 300 Pa · s or higher. . From the viewpoint of obtaining excellent inter-electrode filling properties (resin filling properties), the minimum melt viscosity Y may be 100,000 Pa · s or less, may be 10,000 Pa · s or less, and may be 5,000 Pa · s or less. The minimum melt viscosity Y can be adjusted by changing the composition of the second curable composition and the like.

第2接著劑層3的厚度d2可根據所接著的電路構件的電極高度等而適當設定。就可充分填充電極間的空間而將電極密封,獲得更良好的可靠性的觀點而言,第2接著劑層3的厚度d2可為5 μm以上,且可為200 μm以下。再者,於導電粒子4的一部分自第1接著劑層2的表面露出(例如突出至第2接著劑層3側)的情況下,自第2接著劑層3的與第1接著劑層2側為相反側的表面3a至位於相鄰的導電粒子4、導電粒子4的隔開部分的第1接著劑層2與第2接著劑層3的邊界S為止的距離(圖1中以d2表示的距離)為第2接著劑層3的厚度。The thickness d2 of the second adhesive layer 3 can be appropriately set according to the electrode height and the like of the circuit member to be attached. The thickness d2 of the second adhesive layer 3 may be 5 μm or more and 200 μm or less from the viewpoint that the space between the electrodes can be sufficiently filled to seal the electrodes and obtain better reliability. When a part of the conductive particles 4 is exposed from the surface of the first adhesive layer 2 (for example, it protrudes to the second adhesive layer 3 side), the second adhesive layer 3 and the first adhesive layer 2 are exposed. The distance from the surface 3a on the opposite side to the boundary S between the first adhesive layer 2 and the second adhesive layer 3 located in the adjacent conductive particles 4 and the separated portion of the conductive particles 4 (indicated by d2 in FIG. 1 Distance) is the thickness of the second adhesive layer 3.

就可充分填充電極間的空間而將電極密封,獲得更良好的可靠性的觀點而言,第1接著劑層2的厚度d1相對於第2接著劑層3的厚度d2的比(第1接著劑層2的厚度d1/第2接著劑層3的厚度d2)可為1以上,且可為1000以下。The ratio of the thickness d1 of the first adhesive layer 2 to the thickness d2 of the second adhesive layer 3 (the first adhesive The thickness d1 of the agent layer 2 / the thickness d2 of the second adhesive layer 3 may be 1 or more, and may be 1,000 or less.

接著劑膜1的厚度(構成接著劑膜1的所有層的厚度的合計;圖1中,第1接著劑層2的厚度d1及第2接著劑層3的厚度d2的合計)例如可為5 μm以上,且可為200 μm以下。The thickness of the adhesive film 1 (total thickness of all layers constituting the adhesive film 1; in FIG. 1, the total of the thickness d1 of the first adhesive layer 2 and the thickness d2 of the second adhesive layer 3) may be, for example, 5 μm or more, and may be 200 μm or less.

以上,對本實施形態的電路連接用接著劑膜進行了說明,但本發明並不限定於所述實施形態。As mentioned above, although the adhesive film for circuit connection of this embodiment was demonstrated, this invention is not limited to the said embodiment.

例如,電路連接用接著劑膜可為包含第1接著劑層及第2接著劑層的兩層者,亦可為包括第1接著劑層及第2接著劑層以外的層(例如第3接著劑層)的包含三層以上的層者。第3接著劑層可為具有與以上關於第1接著劑層或第2接著劑層而所述的組成相同的組成的層,亦可為具有與以上關於第1接著劑層或第2接著劑層而所述的物性(例如熔融黏度)相同的物性的層,亦可為具有與以上關於第1接著劑層或第2接著劑層而所述的厚度相同的厚度的層。電路連接用接著劑膜例如可於第1接著劑層的與第2接著劑層為相反側的表面上更包括第3接著劑層。即,電路連接用接著劑膜例如是以第2接著劑層、第1接著劑層及第3接著劑層的順序積層而成。該情況下,第3接著劑層例如與第2接著劑層同樣地包含第2硬化性組成物(例如熱硬化性組成物)。For example, the adhesive film for circuit connection may include two layers including the first adhesive layer and the second adhesive layer, or may include a layer other than the first adhesive layer and the second adhesive layer (for example, the third adhesive layer). Agent layer) contains three or more layers. The third adhesive layer may be a layer having the same composition as that described above with respect to the first adhesive layer or the second adhesive layer, or may have a composition similar to that described above with respect to the first adhesive layer or the second adhesive layer. A layer having the same physical properties (for example, melt viscosity) as described above may be a layer having the same thickness as described above with respect to the first adhesive layer or the second adhesive layer. The adhesive film for circuit connection may further include a third adhesive layer on the surface of the first adhesive layer opposite to the second adhesive layer, for example. That is, the adhesive film for circuit connection is laminated | stacked in the order of a 2nd adhesive layer, a 1st adhesive layer, and a 3rd adhesive layer, for example. In this case, the third adhesive layer contains, for example, a second curable composition (for example, a thermosetting composition) similarly to the second adhesive layer.

另外,所述實施形態的電路連接用接著劑膜為具有各向異性導電性的各向異性導電性接著劑膜,但電路連接用接著劑膜亦可為不具有各向異性導電性的導電性接著劑膜。In addition, the adhesive film for circuit connection of the embodiment is an anisotropic conductive adhesive film having anisotropic conductivity, but the adhesive film for circuit connection may be conductive without anisotropic conductivity. Adhesive film.

<電路連接用接著劑膜的製造方法> 本實施形態的電路連接用接著劑膜1的製造方法例如包括:準備以上所述的第1接著劑層2的準備步驟(第1準備步驟);以及於第1接著劑層2上積層以上所述的第2接著劑層3的積層步驟。電路連接用接著劑膜1的製造方法亦可更包括:準備第2接著劑層3的準備步驟(第2準備步驟)。<Method for Manufacturing Adhesive Film for Circuit Connection> The method for manufacturing the adhesive film 1 for circuit connection in this embodiment includes, for example, a preparation step (first preparation step) for preparing the first adhesive layer 2 described above; and The step of laminating the second adhesive layer 3 described above on the first adhesive layer 2. The method for manufacturing the adhesive film 1 for circuit connection may further include a preparation step (a second preparation step) for preparing the second adhesive layer 3.

於第1準備步驟中,例如,於基材上形成第1接著劑層2而獲得第1接著劑膜,藉此準備第1接著劑層2。具體而言,首先將(A)成分、(B)成分及(C)成分、以及視需要而添加的其他成分加入有機溶媒中,藉由攪拌混合、混煉等進行溶解或分散而製備清漆組成物。然後,於實施了脫模處理的基材上,使用刮刀塗佈機、輥塗機、敷料器、缺角輪塗佈機、模塗機等來塗佈清漆組成物後,藉由加熱而使有機溶媒揮發,從而於基材上形成包含第1硬化性組成物的層。繼而,藉由對包含第1硬化性組成物的層進行光照射或加熱而使第1硬化性組成物硬化,於基材上形成第1接著劑層2(硬化步驟)。藉此,獲得第1接著劑膜。In the first preparation step, for example, a first adhesive layer 2 is formed on a substrate to obtain a first adhesive film, thereby preparing the first adhesive layer 2. Specifically, first, (A) component, (B) component, (C) component, and other components added as needed are added to an organic solvent, and a varnish composition is prepared by dissolving or dispersing by stirring, mixing, kneading, etc. Thing. Then, the varnish composition is applied to the substrate subjected to the mold release treatment by using a doctor blade coater, a roll coater, an applicator, a notch wheel coater, a die coater, or the like, and then heated by heating. The organic solvent is volatilized to form a layer containing the first curable composition on the substrate. Then, the first curable composition is cured by irradiating or heating the layer containing the first curable composition to form a first adhesive layer 2 on the substrate (curing step). Thus, a first adhesive film was obtained.

作為清漆組成物的製備中使用的有機溶媒,較佳為具有可將各成分均勻地溶解或分散的特性者,例如可列舉甲苯、丙酮、甲基乙基酮、甲基異丁基酮、乙酸乙酯、乙酸丙酯、乙酸丁酯等。該些有機溶媒可單獨使用或將兩種以上組合而使用。製備清漆組成物時的攪拌混合及混煉例如可使用攪拌機、磨碎機、三輥、球磨機、珠磨機或均質機來進行。The organic solvent used in the preparation of the varnish composition is preferably one having the property of uniformly dissolving or dispersing each component. Examples include toluene, acetone, methyl ethyl ketone, methyl isobutyl ketone, and acetic acid. Ethyl acetate, propyl acetate, butyl acetate, and the like. These organic solvents may be used alone or in combination of two or more. Stirring, mixing, and kneading in the preparation of the varnish composition can be performed using, for example, a mixer, a mill, a three-roller, a ball mill, a bead mill, or a homogenizer.

作為基材,於藉由光而使第1硬化性組成物硬化的情況下只要為具有可耐受使有機溶媒揮發時的加熱條件的耐熱性者則並無特別限制,於藉由加熱而使第1硬化性組成物硬化的情況下只要為具有可耐受使有機溶媒揮發時的加熱條件及使第1硬化性組成物硬化時的加熱條件的耐熱性者則並無特別限制。作為基材,例如可使用包含延伸聚丙烯(orientedpolypropylene,OPP)、聚對苯二甲酸乙二酯(polyethylene terephthalate,PET)、聚萘二甲酸乙二酯、聚間苯二甲酸乙二酯、聚對苯二甲酸丁二酯、聚烯烴、聚乙酸酯、聚碳酸酯、聚苯硫醚、聚醯胺、聚醯亞胺、纖維素、乙烯-乙酸乙烯酯共聚物、聚氯乙烯、聚偏二氯乙烯、合成橡膠系、液晶聚合物等的基材(例如膜)。As the substrate, when the first curable composition is hardened by light, there is no particular limitation as long as it has heat resistance that can withstand the heating conditions when the organic solvent is volatilized. When the first curable composition is cured, there is no particular limitation as long as it has heat resistance that can withstand the heating conditions when the organic solvent is volatilized and the heating conditions when the first curable composition is cured. As the substrate, for example, oriented polypropylene (OPP), polyethylene terephthalate (PET), polyethylene naphthalate, polyethylene isophthalate, and polyethylene can be used. Butyl terephthalate, polyolefin, polyacetate, polycarbonate, polyphenylene sulfide, polyamide, polyimide, cellulose, ethylene-vinyl acetate copolymer, polyvinyl chloride, poly Substrates (such as films) such as vinylidene chloride, synthetic rubbers, and liquid crystal polymers.

使有機溶媒自塗佈於基材的清漆組成物揮發時的加熱條件較佳設為有機溶媒充分揮發的條件。加熱條件例如可為40℃以上且120℃以下、0.1分鐘以上且10分鐘以下。The heating conditions when the organic solvent is volatilized from the varnish composition applied to the substrate is preferably a condition that the organic solvent is sufficiently volatilized. The heating conditions may be, for example, 40 ° C. or higher and 120 ° C. or lower, and 0.1 minute or longer and 10 minutes or shorter.

硬化步驟中的光的照射中,較佳為使用包含150 nm~750 nm的範圍內的波長的照射光(例如紫外光)。光的照射例如可使用低壓水銀燈、中壓水銀燈、高壓水銀燈、超高壓水銀燈、氙氣燈、金屬鹵化物燈等來進行。光的照射量可以熔融黏度的比(X/Y)成為10以上的方式進行調整。光的照射量例如以波長365 nm的光的累計光量計可為100 mJ/cm2 以上,亦可為200 mJ/cm2 以上,亦可為300 mJ/cm2 以上。光的照射量例如以波長365 nm的光的累計光量計可為10000 mJ/cm2 以下,亦可為5000 mJ/cm2 以下,亦可為3000 mJ/cm2 以下。光的照射量(光的累計光量)越大則有熔融黏度X越大的傾向,且有熔融黏度的比(X/Y)越大的傾向。In the irradiation of light in the curing step, it is preferable to use irradiation light (for example, ultraviolet light) including a wavelength in a range of 150 nm to 750 nm. Light irradiation can be performed using, for example, a low-pressure mercury lamp, a medium-pressure mercury lamp, a high-pressure mercury lamp, an ultra-high-pressure mercury lamp, a xenon lamp, a metal halide lamp, or the like. The amount of light irradiation can be adjusted so that the melt viscosity ratio (X / Y) becomes 10 or more. The irradiation amount of light may be, for example, 100 mJ / cm 2 or more, or 200 mJ / cm 2 or more, or 300 mJ / cm 2 or more, as a cumulative light amount of light having a wavelength of 365 nm. The irradiation amount of light may be, for example, 10,000 mJ / cm 2 or less, or 5,000 mJ / cm 2 or less, or 3,000 mJ / cm 2 or less, as a cumulative light amount of light having a wavelength of 365 nm. The larger the amount of light irradiation (the cumulative amount of light), the greater the melt viscosity X, and the greater the melt viscosity ratio (X / Y).

硬化步驟中的加熱條件可以熔融黏度的比(X/Y)成為10以上的方式進行調整。加熱條件例如可為30℃以上且300℃以下、0.1分鐘以上且5000分鐘以下,亦可為50℃以上且150℃以下、0.1分鐘以上且3000分鐘以下。加熱溫度越高則有熔融黏度X越大的傾向,且有熔融黏度的比(X/Y)越大的傾向。另外,加熱時間越長則有熔融黏度X越大的傾向,且有熔融黏度的比(X/Y)越大的傾向。The heating conditions in the hardening step can be adjusted so that the melt viscosity ratio (X / Y) becomes 10 or more. The heating conditions may be, for example, 30 ° C. to 300 ° C., 0.1 minutes to 5,000 minutes, or 50 ° C. to 150 ° C., 0.1 minutes to 3,000 minutes. The higher the heating temperature, the higher the melt viscosity X, and the higher the melt viscosity ratio (X / Y). In addition, as the heating time is longer, the melt viscosity X tends to be larger, and the melt viscosity ratio (X / Y) tends to be larger.

於第2準備步驟中,除使用(a)成分及(b)成分以及視需要而添加的其他成分、及不實施硬化步驟(不進行光照射及加熱)以外,與第1準備步驟同樣地於基材上形成第2接著劑層3而獲得第2接著劑膜,藉此準備第2接著劑層3。The second preparation step is the same as the first preparation step, except that the components (a) and (b) and other components added as necessary are not used, and the curing step is not performed (light irradiation and heating are not performed). A second adhesive agent layer 3 is formed on a substrate to obtain a second adhesive agent film, thereby preparing a second adhesive agent layer 3.

積層步驟中,可藉由將第1接著劑膜與第2接著劑膜貼合而於第1接著劑層2上積層第2接著劑層3,亦可藉由於第1接著劑層2上塗佈使用(a)成分及(b)成分以及視需要而添加的其他成分而獲得的清漆組成物,使有機溶媒揮發而於第1接著劑層2上積層第2接著劑層3。In the laminating step, the second adhesive layer 3 can be laminated on the first adhesive layer 2 by laminating the first adhesive film and the second adhesive film, or can be applied by the first adhesive layer 2 The cloth uses a varnish composition obtained by using the component (a) and the component (b) and other components added as necessary, and the organic solvent is volatilized to laminate the second adhesive layer 3 on the first adhesive layer 2.

作為使第1接著劑膜與第2接著劑膜貼合的方法,例如可列舉加熱壓製、輥層壓、真空層壓等方法。層壓例如可於0℃~80℃的加熱條件下進行。Examples of a method for bonding the first adhesive film to the second adhesive film include methods such as heat pressing, roll lamination, and vacuum lamination. Lamination can be performed, for example, under heating conditions of 0 ° C to 80 ° C.

<電路連接結構體及其製造方法> 以下,對使用以上所述的電路連接用接著劑膜1作為電路連接材料的電路連接結構體及其製造方法進行說明。<Circuit connection structure and its manufacturing method> Hereinafter, the circuit connection structure using the above-mentioned circuit connection adhesive film 1 as a circuit connection material, and its manufacturing method are demonstrated.

圖2為表示一實施形態的電路連接結構體的示意剖面圖。如圖2所示,電路連接結構體10包括:具有第1電路基板11及形成於第1電路基板11的主面11a上的第1電極12的第1電路構件13;具有第2電路基板14及形成於第2電路基板14的主面14a上的第2電極15的第2電路構件16;以及配置於第1電路構件13及第2電路構件16之間,將第1電極12及第2電極15彼此電性連接的電路連接部17。FIG. 2 is a schematic cross-sectional view showing a circuit connection structure according to an embodiment. As shown in FIG. 2, the circuit connection structure 10 includes a first circuit member 13 including a first circuit substrate 11 and a first electrode 12 formed on a main surface 11 a of the first circuit substrate 11; and a second circuit substrate 14 And the second circuit member 16 of the second electrode 15 formed on the main surface 14 a of the second circuit board 14; and the first electrode 12 and the second electrode 16 are arranged between the first circuit member 13 and the second circuit member 16. The electrodes 15 are electrically connected to the circuit connection portion 17.

第1電路構件13及第2電路構件16彼此可相同亦可不同。第1電路構件13及第2電路構件16可為形成有電極的玻璃基板或塑膠基板、印刷配線板、陶瓷配線板、可撓性配線板、半導體矽IC晶片等。第1電路基板11及第2電路基板14可包括半導體、玻璃、陶瓷等無機物,聚醯亞胺、聚碳酸酯等有機物,玻璃/環氧等複合物等。第1電極12及第2電極15可包含金、銀、錫、釕、銠、鈀、鋨、銥、鉑、銅、鋁、鉬、鈦、銦錫氧化物(Indium Tin Oxide,ITO)、銦鋅氧化物(Indium Zinc Oxide,IZO)、銦鎵鋅氧化物(Indium Gallium Zinc Oxide,IGZO)等。第1電極12及第2電極15可為電路電極,亦可為凸塊(bump)電極。亦可為第1電極12及第2電極15的至少一者為凸塊電極。圖2中,第2電極15為凸塊電極。The first circuit member 13 and the second circuit member 16 may be the same as or different from each other. The first circuit member 13 and the second circuit member 16 may be a glass substrate or a plastic substrate on which electrodes are formed, a printed wiring board, a ceramic wiring board, a flexible wiring board, a semiconductor silicon IC chip, and the like. The first circuit substrate 11 and the second circuit substrate 14 may include inorganic substances such as semiconductors, glass, and ceramics, organic substances such as polyimide, polycarbonate, and composites such as glass / epoxy. The first electrode 12 and the second electrode 15 may include gold, silver, tin, ruthenium, rhodium, palladium, osmium, iridium, platinum, copper, aluminum, molybdenum, titanium, indium tin oxide (ITO), and indium. Indium Zinc Oxide (IZO), Indium Gallium Zinc Oxide (IGZO), etc. The first electrode 12 and the second electrode 15 may be circuit electrodes or bump electrodes. At least one of the first electrode 12 and the second electrode 15 may be a bump electrode. In FIG. 2, the second electrode 15 is a bump electrode.

電路連接部17是由以上所述的接著劑膜1而形成。電路連接部17例如包含接著劑膜1的硬化物。電路連接部17例如包括:第1區域18,位於第1電路構件13與第2電路構件16彼此相向的方向(以下「相向方向」)上的第1電路構件13側,包含以上所述的第1硬化性組成物的導電粒子4以外的(A)成分、(B)成分等成分的硬化物;第2區域19,位於相向方向上的第2電路構件16側,包含含有(a)成分、(b)成分等的以上所述的第2硬化性組成物的硬化物;以及導電粒子4,至少介於第1電極12及第2電極15之間來將第1電極12及第2電極15彼此電性連接。電路連接部可不像第1區域18及第2區域19那樣具有兩個區域,例如亦可包含以上所述的第1硬化性組成物的導電粒子4以外的成分的硬化物與以上所述的第2硬化性組成物的硬化物混合存在的硬化物。The circuit connection portion 17 is formed of the adhesive film 1 described above. The circuit connection part 17 contains the hardened | cured material of the adhesive film 1, for example. The circuit connection portion 17 includes, for example, a first region 18 on the side of the first circuit member 13 in a direction in which the first circuit member 13 and the second circuit member 16 face each other (hereinafter referred to as “opposing direction”), and includes the first section described above. 1 hardened composition of conductive particles other than components (A), (B), and other components; the second region 19 is located on the second circuit member 16 side in the opposite direction, and contains the component (a), (B) the hardened body of the second hardenable composition as described above; and the conductive particles 4 interposed between the first electrode 12 and the second electrode 15 at least between the first electrode 12 and the second electrode 15 Are electrically connected to each other. The circuit connection portion does not need to have two regions like the first region 18 and the second region 19, and may include, for example, a cured product of components other than the conductive particles 4 of the first curable composition described above and the first described above. 2 The hardened | cured material of hardened composition is a hardened | cured material mixed.

圖3(a)、圖3(b)為表示電路連接結構體10的製造方法的示意剖面圖。如圖3(a)、圖3(b)所示,電路連接結構體10的製造方法例如包括以下步驟:使以上所述的接著劑膜1介於具有第1電極12的第1電路構件13、與具有第2電極15的第2電路構件16之間,將第1電路構件13及第2電路構件16熱壓接,而使第1電極12及第2電極15彼此電性連接。3 (a) and 3 (b) are schematic cross-sectional views showing a method of manufacturing the circuit connection structure 10. As shown in FIGS. 3 (a) and 3 (b), the method for manufacturing the circuit connection structure 10 includes, for example, the following steps: the above-mentioned adhesive film 1 is interposed between the first circuit member 13 having the first electrode 12 The first circuit member 13 and the second circuit member 16 are thermocompression-bonded with the second circuit member 16 having the second electrode 15 to electrically connect the first electrode 12 and the second electrode 15 to each other.

具體而言,如圖3(a)所示,首先,準備具有第1電路基板11及形成於第1電路基板11的主面11a上的第1電極12的第1電路構件13、以及具有第2電路基板14及形成於第2電路基板14的主面14a上的第2電極15的第2電路構件16。Specifically, as shown in FIG. 3 (a), first, a first circuit member 13 having a first circuit substrate 11 and a first electrode 12 formed on a main surface 11 a of the first circuit substrate 11, and a first circuit member 13 The second circuit board 14 and the second circuit member 16 of the second electrode 15 formed on the main surface 14 a of the second circuit board 14.

其次,以第1電極12與第2電極15彼此相向的方式配置第1電路構件13與第2電路構件16,於第1電路構件13與第2電路構件16之間配置接著劑膜1。例如,如圖3(a)所示,以第1接著劑層2側與第1電路構件13的安裝面11a相向的方式,將接著劑膜1層壓於第1電路構件13上。其次,以第1電路基板11上的第1電極12與第2電路基板14上的第2電極15彼此相向的方式,於層壓有接著劑膜1的第1電路構件13上配置第2電路構件16。另外,例如,亦可以第1接著劑層2側與第2電路構件16的安裝面14a相向的方式,將接著劑膜1層壓於第2電路構件16上。該情況下,以第1電路基板11上的第1電極12與第2電路基板14上的第2電極15彼此相向的方式,於層壓有接著劑膜1的第2電路構件16上配置第1電路構件13。Next, the first circuit member 13 and the second circuit member 16 are disposed so that the first electrode 12 and the second electrode 15 face each other, and the adhesive film 1 is disposed between the first circuit member 13 and the second circuit member 16. For example, as shown in FIG. 3 (a), the adhesive film 1 is laminated on the first circuit member 13 so that the first adhesive layer 2 side faces the mounting surface 11 a of the first circuit member 13. Next, a second circuit is arranged on the first circuit member 13 on which the adhesive film 1 is laminated so that the first electrode 12 on the first circuit substrate 11 and the second electrode 15 on the second circuit substrate 14 face each other. Component 16. In addition, for example, the adhesive film 1 may be laminated on the second circuit member 16 so that the first adhesive layer 2 side faces the mounting surface 14 a of the second circuit member 16. In this case, the first electrode 12 on the first circuit substrate 11 and the second electrode 15 on the second circuit substrate 14 face each other so that the first electrode 12 is laminated on the second circuit member 16 on which the adhesive film 1 is laminated. 1 电路 机构 13。 1 circuit member 13.

並且,如圖3(b)所示,一邊將第1電路構件13、接著劑膜1及第2電路構件16加熱一邊於厚度方向上對第1電路構件13與第2電路構件16進行加壓,藉此而將第1電路構件13與第2電路構件16彼此熱壓接。此時,將接著劑膜1加熱至第2接著劑層3顯示最低熔融黏度Y的溫度Ty為止。本實施形態中,接著劑膜1的熔融黏度的比(X/Y)為10以上,因而於所述熱壓接時,第2接著劑層3能夠流動,另一方面,第1接著劑層2幾乎不流動。結果,如圖3(b)中箭頭所示,第2接著劑層以填埋第2電極15、第2電極15間的空隙的方式流動,並且藉由所述加熱而硬化。藉此,將第1電極12及第2電極15介隔導電粒子4而彼此電性連接,另外,第1電路構件13及第2電路構件16彼此接著,獲得圖2所示的電路連接結構體10。本實施形態的電路連接結構體10的製造方法中,導電粒子4固定於第1接著劑層2中,另外,第1接著劑層2於所述熱壓接時幾乎不流動,因而可降低相向的電極12及電極15間的連接電阻。因此,可獲得連接可靠性優異的電路連接結構體。再者,於第2硬化性組成物包含光硬化性組成物的情況下,亦可代替藉由加熱的熱壓接,而藉由進行加壓與光照射、或進行加壓與加熱及光照射而將第1電路構件13與第2電路構件16接合。Then, as shown in FIG. 3 (b), the first circuit member 13 and the second circuit member 16 are pressed in the thickness direction while heating the first circuit member 13, the adhesive film 1, and the second circuit member 16. Thereby, the first circuit member 13 and the second circuit member 16 are thermocompression-bonded to each other. At this time, the adhesive film 1 is heated to a temperature Ty at which the second adhesive layer 3 exhibits the lowest melt viscosity Y. In this embodiment, the melt viscosity ratio (X / Y) of the adhesive film 1 is 10 or more. Therefore, the second adhesive layer 3 can flow during the thermocompression bonding. On the other hand, the first adhesive layer 2 Hardly flows. As a result, as shown by an arrow in FIG. 3 (b), the second adhesive layer flows so as to fill the gap between the second electrode 15 and the second electrode 15, and is hardened by the heating. Thereby, the first electrode 12 and the second electrode 15 are electrically connected to each other with the conductive particles 4 interposed therebetween, and the first circuit member 13 and the second circuit member 16 are bonded to each other to obtain a circuit connection structure shown in FIG. 2. 10. In the method of manufacturing the circuit connection structure 10 according to this embodiment, the conductive particles 4 are fixed to the first adhesive layer 2 and the first adhesive layer 2 hardly flows during the thermocompression bonding, so that the opposing direction can be reduced. The connection resistance between the electrodes 12 and 15 of. Therefore, a circuit connection structure having excellent connection reliability can be obtained. When the second curable composition contains a photocurable composition, instead of thermal compression bonding by heating, pressurization and light irradiation may be performed, or pressurization and heating and light irradiation may be performed. The first circuit member 13 and the second circuit member 16 are bonded together.

<接著劑膜收容套組> 圖4為表示一實施形態的接著劑膜收容套組的立體圖。如圖4所示,接著劑膜收容套組20包括:電路連接用接著劑膜1、捲繞有該接著劑膜1的卷軸21、及收容接著劑膜1及卷軸21的收容構件22。<Adhesive film storage kit> FIG. 4 is a perspective view showing an adhesive film storage kit according to an embodiment. As shown in FIG. 4, the adhesive film storage kit 20 includes an adhesive film for circuit connection 1, a reel 21 around which the adhesive film 1 is wound, and a storage member 22 that accommodates the adhesive film 1 and the reel 21.

如圖4所示,接著劑膜1例如為帶狀。帶狀的接著劑膜1例如是藉由將片狀的整幅片材以根據用途的寬度裁斷為長條狀而製作。可於接著劑膜1的其中一個面上設置基材。作為基材,可使用以上所述的PET膜等基材。As shown in FIG. 4, the adhesive film 1 is, for example, a strip. The strip-shaped adhesive film 1 is produced, for example, by cutting the entire sheet-shaped sheet into a strip shape with a width according to the application. A substrate may be provided on one surface of the adhesive film 1. As the substrate, a substrate such as a PET film described above can be used.

卷軸21包括:具有捲繞接著劑膜1的卷芯23的第1側板24、以及以夾隔卷芯23而與第1側板24相向的方式配置的第2側板25。The reel 21 includes a first side plate 24 having a winding core 23 around which the adhesive film 1 is wound, and a second side plate 25 disposed so as to face the first side plate 24 with the winding core 23 interposed therebetween.

第1側板24例如是包含塑膠的圓板,於第1側板24的中央部分設置有剖面圓形的開口部。The first side plate 24 is, for example, a circular plate made of plastic, and a central portion of the first side plate 24 is provided with an opening having a circular cross section.

第1側板24具有的卷芯23為捲繞接著劑膜1的部分。卷芯23例如包含塑膠,形成為厚度與接著劑膜1的寬度相同的圓環狀。卷芯23以包圍第1側板24的開口部的方式固定於第1側板24的內側面。另外,於卷軸21的中央部設置有作為供捲繞裝置或輸出裝置(未圖示)的旋轉軸插入的部分的軸孔26。當於該軸孔26中塞入捲繞裝置或輸出裝置的旋轉軸的狀態下驅動旋轉軸時,卷軸21便會旋轉而不會空轉。亦可於軸孔26中嵌入收容乾燥劑的乾燥劑收容容器。The winding core 23 included in the first side plate 24 is a portion where the adhesive film 1 is wound. The core 23 includes, for example, plastic, and is formed in a ring shape having the same thickness as the width of the adhesive film 1. The core 23 is fixed to the inner surface of the first side plate 24 so as to surround the opening of the first side plate 24. A shaft hole 26 is provided in a central portion of the reel 21 as a part into which a rotation shaft of a winding device or an output device (not shown) is inserted. When the rotating shaft is driven in a state where the rotating shaft of the winding device or the output device is inserted into the shaft hole 26, the winding shaft 21 rotates without idling. A desiccant storage container for storing a desiccant may be embedded in the shaft hole 26.

第2側板25與第1側板24同樣地,例如是包含塑膠的圓板,於第2側板25的中央部分設置有與第1側板24的開口部直徑相同的剖面圓形的開口部。Like the first side plate 24, the second side plate 25 is, for example, a circular plate made of plastic, and a central circular portion is provided with a circular cross-sectional opening portion having the same diameter as the opening portion of the first side plate 24.

收容構件22例如呈袋狀,收容接著劑膜1及卷軸21。收容構件22具有用於將接著劑膜1及卷軸21收容(插入)至收容構件22的內部的插入口27。The storage member 22 has, for example, a bag shape, and stores the adhesive film 1 and the reel 21. The storage member 22 includes an insertion port 27 for storing (inserting) the adhesive film 1 and the reel 21 into the storage member 22.

收容構件22具有使收容構件22的內部自外部能夠視認的視認部28。圖4所示的收容構件22是以收容構件22的整體成為視認部28的方式構成。The storage member 22 includes a viewing portion 28 that allows the inside of the storage member 22 to be viewed from the outside. The storage member 22 shown in FIG. 4 is configured so that the entire storage member 22 becomes the viewing portion 28.

視認部28具有對可見光的透射性。例如,當以波長450 nm~750 nm的範圍測定視認部28對光的透射率時,於波長450 nm~750 nm之間存在至少一個光的透射率的平均值為30%以上且波長寬度為50 nm的區域。視認部28的光的透射率可藉由製作將視認部28截取為規定大小的試樣,並利用紫外可見分光光度計測定試樣的光的透射率而獲得。收容構件22具有此種視認部28,因而自收容構件22的外部亦可確認到收容構件22內部的例如貼附於卷軸21的製品名、批號、有效期等各種資訊。藉此,可期待防止混入錯誤的製品、及提升分類作業的效率。The visual recognition portion 28 has transmissivity to visible light. For example, when measuring the light transmittance of the visual inspection portion 28 in the range of 450 nm to 750 nm, the average value of the transmittance of at least one light between the wavelengths of 450 nm to 750 nm is 30% or more and the wavelength width is 50 nm area. The light transmittance of the visual inspection portion 28 can be obtained by preparing a sample obtained by cutting the visual inspection portion 28 into a predetermined size, and measuring the light transmittance of the sample using an ultraviolet-visible spectrophotometer. Since the storage member 22 has such a viewing portion 28, various information such as a product name, a batch number, and an expiration date attached to the reel 21 can also be confirmed from the outside of the storage member 22. With this, it is expected to prevent the wrong product from being mixed in and improve the efficiency of the classification operation.

視認部28對波長365 nm的光的透射率為10%以下。視認部28對波長365 nm的光的透射率為10%以下,因此可抑制使用光聚合起始劑作為(B)成分的情況下的、由自收容構件22的外部入射至內部的光及第1接著劑層2中殘留的光聚合起始劑所引起的第2硬化性組成物的硬化。結果,可抑制於高溫高濕環境下容易產生電路構件與電路連接部之間的剝離、接著劑膜的連接電阻的降低效果減小等不良狀況的產生。就進一步抑制自光聚合起始劑產生活性種(例如自由基)的觀點而言,視認部28對波長365 nm的光的透射率較佳為10%以下,更佳為5%以下,進而佳為1%以下,特佳為0.1%以下。The visible portion 28 has a transmittance of 10% or less for light having a wavelength of 365 nm. The visible portion 28 has a transmittance of 10% or less for light having a wavelength of 365 nm. Therefore, in the case where a photopolymerization initiator is used as the (B) component, the light and the light incident from the outside to the inside of the storage member 22 can be suppressed. 1 The second curable composition is hardened by the photopolymerization initiator remaining in the adhesive layer 2. As a result, it is possible to suppress the occurrence of undesirable conditions such as easy peeling between the circuit member and the circuit connection portion under a high temperature and high humidity environment, and a reduction in the connection resistance of the adhesive film. From the viewpoint of further suppressing the generation of active species (such as radicals) from the photopolymerization initiator, the transmittance of the viewing portion 28 to light having a wavelength of 365 nm is preferably 10% or less, more preferably 5% or less, and further preferably It is 1% or less, and particularly preferably 0.1% or less.

就同樣的觀點而言,視認部28對能夠自所述光聚合起始劑((B)成分)產生自由基、陽離子或陰離子的波長區域下的光的透射率的最大值較佳為10%以下,更佳為5%以下,進而佳為1%以下,特佳為0.1%以下。具體而言,視認部28對波長254 nm~405 nm的光的透射率的最大值較佳為10%以下,更佳為5%以下,進而佳為1%以下,特佳為0.1%以下。From the same viewpoint, the maximum value of the light transmittance of the viewing portion 28 in the wavelength region capable of generating radicals, cations, or anions from the photopolymerization initiator (component (B)) is preferably 10%. Below, more preferably 5% or less, further preferably 1% or less, and particularly preferably 0.1% or less. Specifically, the maximum value of the transmittance of the visible portion 28 for light having a wavelength of 254 nm to 405 nm is preferably 10% or less, more preferably 5% or less, still more preferably 1% or less, and particularly preferably 0.1% or less.

視認部28(收容構件22)例如是由厚度10 μm~5000 μm的片材所形成。該片材包括視認部28對波長365 nm的光的透射率為10%以下的材料。此種材料可包含一種成分,亦可包含多種成分。作為該材料,例如可列舉低密度聚乙烯、直鏈狀低密度聚乙烯、聚碳酸酯、聚酯、丙烯酸樹脂、聚醯胺、玻璃等。該些材料亦可包含紫外線吸收劑。視認部28亦可具有藉由積層透光性不同的多個層而形成的積層結構。該情況下,構成視認部28的各層可包含以上所述的材料。The visual recognition portion 28 (the storage member 22) is formed of, for example, a sheet having a thickness of 10 μm to 5000 μm. The sheet includes a material having a transmittance of the viewing portion 28 of light having a wavelength of 365 nm of 10% or less. Such materials may contain one component or multiple components. Examples of the material include low-density polyethylene, linear low-density polyethylene, polycarbonate, polyester, acrylic resin, polyamide, and glass. These materials may also contain ultraviolet absorbers. The visual recognition part 28 may have a laminated structure formed by laminating a plurality of layers having different light transmission properties. In this case, each of the layers constituting the visual recognition portion 28 may include the materials described above.

為了防止收容時空氣自外部侵入,例如亦可藉由利用密封機等進行封口而將插入口27密閉。該情況下,較佳為於封閉插入口27前預先將收容構件22內的空氣抽吸去除。可期待自收容的初始階段起收容構件22內的濕氣變少,且防止空氣自外部進入。另外,藉由收容構件22的內表面與卷軸21密接,可防止因搬運時的振動使收容構件22的內表面與卷軸21的表面摩擦而產生異物,並且可防止對卷軸21的側板24、側板25的外側面的刮傷。In order to prevent the invasion of air from the outside during storage, the insertion port 27 may be closed by, for example, sealing with a sealing machine or the like. In this case, it is preferable to remove the air in the accommodating member 22 in advance before closing the insertion port 27. It is expected that moisture in the storage member 22 will be reduced from the initial stage of storage, and air can be prevented from entering from the outside. In addition, the inner surface of the accommodating member 22 is in close contact with the reel 21 to prevent foreign matter from being generated by friction between the inner surface of the accommodating member 22 and the surface of the reel 21 due to vibration during transportation, and to prevent the side plate 24 and side plates of the reel 21 25 scratches on the outer side.

所述實施形態中,收容構件是以收容構件的整體成為視認部的方式構成,於另一實施形態中,收容構件亦可於收容構件的一部分具有視認部。例如,收容構件可於收容構件的側面的大致中央具有矩形形狀的視認部。該情況下,收容構件的視認部以外的部分例如可呈黑色,以便不透射紫外光及可見光。In the said embodiment, a storage member is comprised so that the whole storage member may become a visual recognition part. In another embodiment, a storage member may have a visual recognition part in a part of a storage member. For example, the accommodating member may have a rectangular viewing portion at substantially the center of the side surface of the accommodating member. In this case, the portion other than the visual recognition portion of the storage member may be black, for example, so as not to transmit ultraviolet light and visible light.

另外,所述實施形態中,收容構件的形狀為袋狀,收容構件例如亦可為箱狀。收容構件較佳為帶有用於開封的切痕。該情況下,使用時的開封作業變容易。 [實施例]In addition, in the embodiment, the shape of the storage member is a bag shape, and the storage member may be, for example, a box shape. The receiving member is preferably provided with a cutout for opening. In this case, the opening operation at the time of use becomes easy. [Example]

以下,藉由實施例來更具體地說明本發明,但本發明並不限定於實施例。Hereinafter, the present invention will be described more specifically with reference to examples, but the present invention is not limited to the examples.

<聚胺基甲酸酯丙烯酸酯(UA1)的合成> 於具備攪拌機、溫度計、具有氯化鈣乾燥管的回流冷卻管、及氮氣導入管的反應容器中,歷時3小時均勻地滴加聚(1,6-己二醇碳酸酯)(商品名:杜南醇(Duranol)T5652,旭化成化學(Asahi Kasei Chemicals)股份有限公司製造,數量平均分子量為1000)2500質量份(2.50 mol)、及異佛爾酮二異氰酸酯(西格瑪奧德里奇(Sigma-Aldrich)公司製造)666質量份(3.00 mol)。繼而,向反應容器中充分地導入氮氣後,將反應容器內加熱至70℃~75℃來進行反應。其次,向反應容器中添加對苯二酚單甲基醚(西格瑪奧德里奇公司製造)0.53質量份(4.3 mmol)、及二月桂酸二丁基錫(西格瑪奧德里奇公司製造)5.53質量份(8.8 mmol)後,加入丙烯酸2-羥基乙酯(西格瑪奧德里奇公司製造)238質量份(2.05 mol),於空氣環境下以70℃反應6小時。藉此而獲得聚胺基甲酸酯丙烯酸酯(UA1)。聚胺基甲酸酯丙烯酸酯(UA1)的重量平均分子量為15000。再者,重量平均分子量是依照下述條件,藉由凝膠滲透層析儀(GPC)使用標準聚苯乙烯的校準曲線而測定出。 (測定條件) 裝置:東曹(Tosoh)股份有限公司製造的GPC-8020 檢測器:東曹股份有限公司製造的RI-8020 管柱:日立化成股份有限公司製造的Gelpack GLA160S+GLA150S 試樣濃度:120 mg/3 mL 溶媒:四氫呋喃 注入量:60 μL 壓力:2.94×106 Pa(30 kgf/cm2 ) 流量:1.00 mL/min<Synthesis of Polyurethane Acrylate (UA1)> In a reaction vessel equipped with a stirrer, a thermometer, a reflux cooling tube having a calcium chloride drying tube, and a nitrogen introduction tube, the polymerization was uniformly added dropwise over 3 hours ( 1,6-hexanediol carbonate) (Trade name: Duranol T5652, manufactured by Asahi Kasei Chemicals Co., Ltd., the number average molecular weight is 1000) 2,500 parts by mass (2.50 mol), and Fluorone diisocyanate (manufactured by Sigma-Aldrich) 666 parts by mass (3.00 mol). Then, after sufficiently introducing nitrogen gas into the reaction vessel, the reaction vessel was heated to 70 ° C to 75 ° C to perform the reaction. Next, 0.53 parts by mass (4.3 mmol) of hydroquinone monomethyl ether (manufactured by Sigma-Aldrich) and 5.53 parts by mass of dibutyltin dilaurate (manufactured by Sigma-Aldrich) were added to the reaction vessel (8.8 mmol), 238 parts by mass (2.05 mol) of 2-hydroxyethyl acrylate (manufactured by Sigma-Aldrich) was added, and the mixture was reacted at 70 ° C. for 6 hours in an air environment. In this way, a polyurethane acrylate (UA1) was obtained. The weight average molecular weight of the polyurethane acrylate (UA1) was 15,000. The weight-average molecular weight was measured by a gel permeation chromatography (GPC) calibration curve using standard polystyrene in accordance with the following conditions. (Measurement conditions) Device: GPC-8020 manufactured by Tosoh Co., Ltd. Detector: RI-8020 manufactured by Tosoh Co., Ltd. Column: Gelpack GLA160S + GLA150S manufactured by Hitachi Chemical Co., Ltd. Sample concentration: 120 mg / 3 mL solvent: tetrahydrofuran injection volume: 60 μL pressure: 2.94 × 10 6 Pa (30 kgf / cm 2 ) flow rate: 1.00 mL / min

<導電粒子的製作> 於聚苯乙烯粒子的表面上,以層的厚度為0.2 μm的方式形成包含鎳的層。以所述方式獲得平均粒徑為4 μm、最大粒徑為4.5 μm、比重為2.5的導電粒子。<Production of Conductive Particles> A layer containing nickel was formed on the surface of the polystyrene particles so that the layer thickness was 0.2 μm. In this manner, conductive particles having an average particle diameter of 4 μm, a maximum particle diameter of 4.5 μm, and a specific gravity of 2.5 were obtained.

<第1硬化性組成物的清漆(清漆組成物)的製備> 將以下所示的成分以表1所示的調配量(質量份)混合,製備第1硬化性組成物1的清漆及第1硬化性組成物2的清漆。再者,表1中記載的導電粒子的含量(體積%)及填充材的含量(體積%)是以第1硬化性組成物的總體積為基準的含量。 (聚合性化合物) A1:二環戊二烯型二丙烯酸酯(商品名:萊特丙烯酸酯(Light Acrylate)DCP-A,東亞合成股份有限公司製造) A2:如上所述般合成的聚胺基甲酸酯丙烯酸酯(UA1) A3:2-甲基丙烯醯氧基乙基酸式磷酸酯(商品名:萊特酯(Light Ester)P-2M,共榮社化學股份有限公司製造) (聚合起始劑) B1:1,2-辛二酮,1-[4-(苯硫基)苯基-,2-(O-苯甲醯基肟)](商品名:豔佳固(Irgacure)(註冊商標)OXE01,巴斯夫(BASF)公司製造) B2:過氧化苯甲醯基(商品名:耐帕(NYPER)BMT-K40,日油股份有限公司製造) (導電粒子) C1:如上所述般製作的導電粒子 (熱塑性樹脂) D1:雙酚A型苯氧基樹脂(商品名:PKHC,聯合碳化物(Union Carbide)公司製造) (偶合劑) E1:3-甲基丙烯醯氧基丙基三甲氧基矽烷(商品名:KBM503,信越化學工業股份有限公司製造) (填充材) F1:二氧化矽微粒子(商品名:R104,日本艾羅技(AEROSIL)股份有限公司製造,平均粒徑(一次粒徑):12 nm,比重:2) (溶劑) G1:甲基乙基酮<Preparation of the first varnish (varnish composition) of the first curable composition> The components shown below were mixed at the compounding amount (parts by mass) shown in Table 1 to prepare the varnish of the first curable composition 1 and the first Varnish of the curable composition 2. The content (vol%) of the conductive particles and the content (vol%) of the filler described in Table 1 are based on the total volume of the first curable composition. (Polymerizable compound) A1: Dicyclopentadiene-type diacrylate (trade name: Light Acrylate DCP-A, manufactured by Toa Synthesis Co., Ltd.) A2: Polyaminomethyl synthesized as described above Ester Acrylate (UA1) A3: 2-Methacryloxyethyl Ethyl Phosphate (Trade Name: Light Ester P-2M, manufactured by Kyoeisha Chemical Co., Ltd.) (Initiation of polymerization Agent) B1: 1,2-octanedione, 1- [4- (phenylthio) phenyl-, 2- (O-benzylideneoxime)] (trade name: Irgacure (registered Trademark) OXE01, manufactured by BASF) B2: benzamyl peroxide (trade name: NYPER) BMT-K40, manufactured by Nippon Oil Co., Ltd. (conductive particles) C1: produced as described above Conductive particles (thermoplastic resin) D1: bisphenol A type phenoxy resin (trade name: PKHC, manufactured by Union Carbide) (coupling agent) E1: 3-methacryloxypropyltrimethyl Oxysilane (trade name: KBM503, manufactured by Shin-Etsu Chemical Industry Co., Ltd.) (filler) F1: Silicon dioxide fine particles (trade name: R104, manufactured by Japan Aerosil Corporation), average particle size (primary particle size): 12 nm, specific gravity: 2) (solvent) G1: methyl ethyl ketone

[表1] [Table 1]

<第2硬化性組成物的清漆(清漆組成物)的製備> 作為聚合性化合物a1~聚合性化合物a3、聚合起始劑b1、熱塑性樹脂d1、偶合劑e1、填充材f1及溶劑g1,使用與第1硬化性組成物中的聚合性化合物A1~聚合性化合物A3、聚合起始劑B2、熱塑性樹脂D1、偶合劑E1、填充材F1及溶劑G1相同者,將該些成分以表2所示的調配量(質量份)混合,製備第2硬化性組成物1的清漆。再者,表2中記載的填充材的含量(體積%)是以第2硬化性組成物的總體積為基準的含量。<Preparation of varnish (varnish composition) of the second curable composition> As the polymerizable compound a1 to polymerizable compound a3, the polymerization initiator b1, the thermoplastic resin d1, the coupling agent e1, the filler f1, and the solvent g1, use The polymerizable compounds A1 to A3, the polymerization initiator B2, the thermoplastic resin D1, the coupling agent E1, the filler F1, and the solvent G1 in the first curable composition are the same as those in Table 2 The blending amounts (parts by mass) shown were mixed to prepare a varnish of the second curable composition 1. The content (vol%) of the fillers described in Table 2 is a content based on the total volume of the second curable composition.

[表2] [Table 2]

(實施例1) [第1接著劑膜的製作] 使用塗敷裝置將第1硬化性組成物1的清漆塗佈於厚度50 μm的PET膜上。繼而,進行70℃、3分鐘的熱風乾燥,於PET膜上形成厚度(乾燥後的厚度)為2 μm的包含第1硬化性組成物1的層。其次,對包含第1硬化性組成物1的層,使用金屬鹵化物燈以累計光量為300 mJ/cm2 的方式進行光照射,使聚合性化合物聚合。藉此,使第1硬化性組成物1硬化,形成第1接著劑層。藉由以上操作,獲得於PET膜上具備厚度2 μm的第1接著劑層的第1接著劑膜。此時的導電粒子密度為約7000 pcs/mm2 。再者,第1接著劑層的厚度是使用奧林巴斯(Olympus)股份有限公司製造的雷射顯微鏡OLS4100進行測定。(Example 1) [Production of first adhesive film] A varnish of the first curable composition 1 was applied to a PET film having a thickness of 50 μm using a coating device. Then, it was dried by hot air at 70 ° C. for 3 minutes to form a layer containing the first curable composition 1 with a thickness (thickness after drying) of 2 μm on the PET film. Next, the layer containing the first curable composition 1 was irradiated with light using a metal halide lamp so that the accumulated light amount was 300 mJ / cm 2 to polymerize the polymerizable compound. Thereby, the 1st curable composition 1 is hardened, and the 1st adhesive layer is formed. By the above operations, a first adhesive film having a first adhesive layer having a thickness of 2 μm on a PET film was obtained. The density of the conductive particles at this time was about 7000 pcs / mm 2 . The thickness of the first adhesive layer was measured using a laser microscope OLS4100 manufactured by Olympus Co., Ltd.

[第2接著劑膜的製作] 使用塗敷裝置將第2硬化性組成物1的清漆塗佈於厚度50 μm的PET膜上。繼而,進行70℃、3分鐘的熱風乾燥,於PET膜上形成厚度為10 μm的第2接著劑層(包含第2硬化性組成物1的層)。藉由以上操作,獲得於PET膜上具備第2接著劑層的第2接著劑膜。[Production of second adhesive film] The varnish of the second curable composition 1 was applied to a PET film having a thickness of 50 μm using a coating device. Then, it was dried by hot air at 70 ° C. for 3 minutes to form a second adhesive layer (a layer including the second curable composition 1) having a thickness of 10 μm on the PET film. By the above operations, a second adhesive film including a second adhesive layer on a PET film was obtained.

[熔融黏度的測定] 藉由以下方法測定第2接著劑層顯示最低熔融黏度的溫度下的第1接著劑層的熔融黏度、及第2接著劑層的最低熔融黏度。具體而言,首先,對第1接著劑膜及第2接著劑膜分別以成為200 μm的厚度的方式於40℃下進行加熱,同時利用輥層壓機進行層壓。然後,切斷為0.8 cmf,獲得試驗片。繼而,對所獲得的試驗片進行使用熔融黏度測定裝置(商品名:ARES-G2,熱分析儀器(TA Instruments)公司製造)的熔融黏度測定。測定條件設為測定溫度:0℃~200℃、升溫速度:10℃/min、頻率:10 Hz、應變:0.5%。[Measurement of Melt Viscosity] The melt viscosity of the first adhesive layer and the minimum melt viscosity of the second adhesive layer at a temperature at which the second adhesive layer exhibited the lowest melt viscosity were measured by the following methods. Specifically, first, the first adhesive film and the second adhesive film were each heated at 40 ° C. so as to have a thickness of 200 μm, and simultaneously laminated with a roll laminator. Then, it cut | disconnected to 0.8 cmf, and obtained the test piece. Next, the obtained test piece was subjected to melt viscosity measurement using a melt viscosity measurement device (trade name: ARES-G2, manufactured by TA Instruments). The measurement conditions were a measurement temperature: 0 ° C to 200 ° C, a temperature increase rate: 10 ° C / min, a frequency: 10 Hz, and a strain: 0.5%.

第2接著劑層顯示最低熔融黏度的溫度(溫度Ty)為103℃。溫度Ty下的第1接著劑層的熔融黏度(熔融黏度X)為6×104 Pa·s。第2接著劑層的最低熔融黏度(最低熔融黏度Y)為1×103 Pa·s。根據該些結果,熔融黏度的比(X/Y)為60。再者,所述測定中,將第1接著劑膜及第2接著劑膜的厚度設為200 μm,但接著劑膜的厚度並無特別限定,例如可為100 μm~1000 μm。The temperature (temperature Ty) at which the second adhesive layer showed the lowest melt viscosity was 103 ° C. The melt viscosity (melt viscosity X) of the first adhesive layer at the temperature Ty was 6 × 10 4 Pa · s. The minimum melt viscosity (lowest melt viscosity Y) of the second adhesive layer was 1 × 10 3 Pa · s. From these results, the melt viscosity ratio (X / Y) was 60. In the measurement, the thickness of the first adhesive film and the second adhesive film is 200 μm, but the thickness of the adhesive film is not particularly limited, and may be, for example, 100 μm to 1000 μm.

[電路連接用接著劑膜的製作] 對第1接著劑膜與第2接著劑膜,與作為基材的PET膜一併於40℃下進行加熱,同時利用輥層壓機進行層壓。藉此而製作具備第1接著劑層與第2接著劑層積層而成的兩層構成的電路連接用接著劑膜的帶基材的電路連接用接著劑膜。[Production of Adhesive Film for Circuit Connection] The first adhesive film and the second adhesive film were heated at 40 ° C. together with a PET film as a base material, and laminated with a roll laminator. Thereby, a base material-equipped adhesive film for circuit connection including a two-layered circuit connection adhesive film including a first adhesive layer and a second adhesive layer is produced.

[電路連接結構體的製作] 介隔所製作的電路連接用接著劑膜,對間距25 μm的COF(弗萊克斯得(FLEXSEED)公司製造)、及玻璃基板上具備包含非晶氧化銦錫(ITO)的薄膜電極(高度:1200 Å)的帶薄膜電極的玻璃基板(吉奧馬(Geomatec)公司製造),使用熱壓接裝置(加熱方式:接觸加熱(contact heat)型,太陽機械製作所股份有限公司製造),以170℃、6 MPa下4秒鐘的條件進行加熱加壓,跨及寬度1 mm進行連接,製作包括由電路連接用接著劑膜所形成的電路連接部的電路連接結構體(連接結構體)。再者,於連接時,以電路連接用接著劑膜中的第1接著劑層側的表面與玻璃基板相向的方式將電路連接用接著劑膜配置於玻璃基板上。[Fabrication of circuit connection structure] The adhesive film for circuit connection prepared through the spacer was provided with a COF (manufactured by FLEXSEED) with a pitch of 25 μm and a glass substrate including amorphous indium tin oxide ( ITO) thin-film electrode (height: 1200 Å) glass substrate with thin-film electrode (manufactured by Geomatics), using a thermocompression device (heating method: contact heat type, Taiyo Seiki Co., Ltd.) (Manufactured by the company), heated and pressurized under conditions of 170 ° C and 6 MPa for 4 seconds, and connected across a width of 1 mm to produce a circuit connection structure including a circuit connection portion formed by an adhesive film for circuit connection ( Connection structure). In addition, at the time of connection, the adhesive film for circuit connection was arrange | positioned on the glass substrate so that the surface on the side of the 1st adhesive layer in a circuit connection adhesive film might face a glass substrate.

[剝離評價] 使用光學顯微鏡來觀察所獲得的電路連接結構體的剛剛連接後的連接外觀、及高溫高濕試驗後的連接外觀,進行剝離評價。具體而言,自帶薄膜電極的玻璃基板側測定該玻璃基板與電路連接部之間產生剝離的面積(剝離面積)。高溫高濕試驗是藉由於85℃、85%RH的恆溫恆濕槽中放置200小時來進行。將結果示於表3中。[Peel Evaluation] Using an optical microscope, the connection appearance of the obtained circuit connection structure immediately after connection and the connection appearance after the high-temperature and high-humidity test were observed, and peel evaluation was performed. Specifically, the area (peeling area) where peeling occurred between this glass substrate and a circuit connection part was measured from the glass substrate side with a thin-film electrode. The high-temperature and high-humidity test was performed by leaving it in a constant temperature and humidity tank at 85 ° C. and 85% RH for 200 hours. The results are shown in Table 3.

[耐黏連性評價] 將所製作的帶基材的電路連接用接著劑膜切割為0.6 mm,獲得帶狀的帶基材的接著劑膜。準備包括卷芯及環狀側板的接著帶用卷軸,所述卷芯的寬度為0.7 mm、內徑為40 mm、外徑為65 mm,所述環狀側板於卷芯的兩端部各設置有一片(共計兩片),厚度為2 mm、內徑為40 mm、外徑為125 mm且包含塑膠,使接著劑膜側的面為內側而將所述帶狀的帶基材的接著劑膜捲繞於該接著帶用卷軸上。以如上所述的方式獲得將長度50 m及寬度0.6 mm的帶基材的接著劑膜捲繞於卷芯而成的接著劑卷軸。[Evaluation of blocking resistance] The prepared adhesive film for circuit connection with a substrate was cut to 0.6 mm to obtain a tape-shaped adhesive film with a substrate. A reel for adhesive tape including a core and an annular side plate having a width of 0.7 mm, an inner diameter of 40 mm, and an outer diameter of 65 mm was prepared. The annular side plates were provided at both ends of the core. One sheet (two sheets in total), with a thickness of 2 mm, an inner diameter of 40 mm, an outer diameter of 125 mm, and containing plastic so that the side of the adhesive film side is the inner side, and the adhesive tape with the substrate is applied The film is wound on a roll for this adhesive tape. In the manner described above, an adhesive reel obtained by winding an adhesive film with a substrate having a length of 50 m and a width of 0.6 mm around a winding core was obtained.

將所獲得的接著劑卷軸於30℃的恆溫槽中放置24小時,其後確認是否無問題地將接著劑膜拉出。將無問題地拉出的情況評價為A,將拉出時產生對基材的貼附(黏連)等問題的情況評價為B。將結果示於表3中。The obtained adhesive reel was left in a thermostatic bath at 30 ° C. for 24 hours, and then it was confirmed whether the adhesive film was pulled out without any problem. A case where it was pulled out without problems was evaluated as A, and a case where problems such as adhesion (adhesion) to the base material occurred when it was pulled out was evaluated as B. The results are shown in Table 3.

(實施例2) 於第1接著劑膜的製作時,以累計光量為2000 mJ/cm2 的方式進行光照射,除此以外,以與實施例1相同的方式製作電路連接用接著劑膜及電路連接結構體,並以與實施例1相同的方式進行熔融黏度測定、剝離評價及耐黏連性評價。將結果示於表3中。(Example 2) In the production of the first adhesive film, light irradiation was performed so that the cumulative light amount was 2000 mJ / cm 2. Except that, an adhesive film for circuit connection was produced in the same manner as in Example 1 and The circuit-connected structure was subjected to melt viscosity measurement, peeling evaluation, and blocking resistance evaluation in the same manner as in Example 1. The results are shown in Table 3.

(實施例3) 使用第1硬化性組成物2來代替第1硬化性組成物1,以及於第1接著劑膜的製作時,藉由以100℃對包含第1硬化性組成物2的層進行20分鐘加熱來代替光照射而使其硬化,除此以外,以與實施例1相同的方式製作電路連接用接著劑膜及電路連接結構體,並以與實施例1相同的方式進行熔融黏度測定、剝離評價及耐黏連性評價。將結果示於表3中。(Example 3) The first curable composition 2 was used instead of the first curable composition 1, and when the first adhesive film was produced, the layer containing the first curable composition 2 was heated at 100 ° C. Except that heating was performed for 20 minutes instead of light irradiation to harden, an adhesive film for circuit connection and a circuit connection structure were produced in the same manner as in Example 1, and the melt viscosity was performed in the same manner as in Example 1. Measurement, peel evaluation and blocking resistance evaluation. The results are shown in Table 3.

(實施例4) 使用第1硬化性組成物2來代替第1硬化性組成物1,以及於第1接著劑膜的製作時,藉由以100℃對包含第1硬化性組成物2的層進行180分鐘加熱來代替光照射而使其硬化,除此以外,以與實施例1相同的方式製作電路連接用接著劑膜及電路連接結構體,並以與實施例1相同的方式進行熔融黏度測定、剝離評價及耐黏連性評價。將結果示於表3中。(Example 4) The first curable composition 2 was used in place of the first curable composition 1, and when the first adhesive film was produced, the layer containing the first curable composition 2 was heated at 100 ° C. Except that heating was performed for 180 minutes instead of light irradiation to harden, except that an adhesive film for circuit connection and a circuit connection structure were produced in the same manner as in Example 1, and the melt viscosity was performed in the same manner as in Example 1. Measurement, peel evaluation and blocking resistance evaluation. The results are shown in Table 3.

(實施例5) 使用第1硬化性組成物2來代替第1硬化性組成物1,以及於第1接著劑膜的製作時,藉由以100℃對包含第1硬化性組成物2的層進行5分鐘加熱來代替光照射而使其硬化,除此以外,以與實施例1相同的方式製作電路連接用接著劑膜及電路連接結構體,並以與實施例1相同的方式進行熔融黏度測定、剝離評價及耐黏連性評價。將結果示於表3中。(Example 5) The first curable composition 2 was used in place of the first curable composition 1, and when the first adhesive film was produced, the layer containing the first curable composition 2 was heated at 100 ° C. Except that heating was performed for 5 minutes instead of light irradiation to harden, except that an adhesive film for circuit connection and a circuit connection structure were produced in the same manner as in Example 1, and melt viscosity was performed in the same manner as in Example 1. Measurement, peel evaluation and blocking resistance evaluation. The results are shown in Table 3.

(比較例1) 使用第1硬化性組成物2來代替第1硬化性組成物1,以及於第1接著劑膜的製作時,不進行光照射(不使包含第1硬化性組成物2的層硬化),除此以外,以與實施例1相同的方式製作電路連接用接著劑膜及電路連接結構體,並以與實施例1相同的方式進行熔融黏度測定、剝離評價及耐黏連性評價。將結果示於表4中。(Comparative Example 1) The first curable composition 2 was used instead of the first curable composition 1, and no light was irradiated during the production of the first adhesive film (the first curable composition 2 was not made). Except for layer hardening), an adhesive film for circuit connection and a circuit connection structure were produced in the same manner as in Example 1, and melt viscosity measurement, peeling evaluation, and blocking resistance were performed in the same manner as in Example 1. Evaluation. The results are shown in Table 4.

(比較例2) 於第1接著劑膜的製作時,以累計光量為50 mJ/cm2 的方式進行光照射,除此以外,以與實施例1相同的方式製作電路連接用接著劑膜及電路連接結構體,並以與實施例1相同的方式進行熔融黏度測定、剝離評價及耐黏連性評價。將結果示於表4中。(Comparative Example 2) In the production of the first adhesive film, light irradiation was performed so that the accumulated light amount was 50 mJ / cm 2. Except that, an adhesive film for circuit connection was produced in the same manner as in Example 1 and The circuit-connected structure was subjected to melt viscosity measurement, peeling evaluation, and blocking resistance evaluation in the same manner as in Example 1. The results are shown in Table 4.

(比較例3) 使用第1硬化性組成物2來代替第1硬化性組成物1,以及於第1接著劑膜的製作時,藉由以60℃對包含第1硬化性組成物2的層進行30分鐘加熱來代替光照射而使其硬化,除此以外,以與實施例1相同的方式製作電路連接用接著劑膜及電路連接結構體,並以與實施例1相同的方式進行熔融黏度測定、剝離評價及耐黏連性評價。將結果示於表4中。(Comparative Example 3) The first curable composition 2 was used in place of the first curable composition 1, and when the first adhesive film was produced, the layer containing the first curable composition 2 was heated at 60 ° C. Except that heating was performed for 30 minutes instead of light irradiation to harden, except that an adhesive film for circuit connection and a circuit connection structure were produced in the same manner as in Example 1, and the melt viscosity was performed in the same manner as in Example 1. Measurement, peel evaluation and blocking resistance evaluation. The results are shown in Table 4.

[表3] [table 3]

[表4] [Table 4]

1‧‧‧電路連接用接著劑膜1‧‧‧ Adhesive film for circuit connection

2‧‧‧第1接著劑層2‧‧‧ the first adhesive layer

2a‧‧‧第1接著劑層的與第2接著劑層側為相反側的表面2a‧‧‧ The surface of the first adhesive layer opposite to the second adhesive layer side

3‧‧‧第2接著劑層3‧‧‧The second adhesive layer

3a‧‧‧第2接著劑層的與第1接著劑層側為相反側的表面3a‧‧‧ surface of the second adhesive layer opposite to the first adhesive layer side

4‧‧‧導電粒子4‧‧‧ conductive particles

5‧‧‧接著劑成分5‧‧‧ Adhesive ingredients

10‧‧‧電路連接結構體10‧‧‧Circuit connection structure

11‧‧‧第1電路基板11‧‧‧1st circuit board

11a‧‧‧第1電路基板的主面11a‧‧‧ Main surface of the first circuit board

12‧‧‧電路電極(第1電極)12‧‧‧Circuit electrode (first electrode)

13‧‧‧第1電路構件13‧‧‧The first circuit component

14‧‧‧第2電路基板14‧‧‧ 2nd circuit board

14a‧‧‧第2電路基板的主面14a‧‧‧ Main surface of the second circuit board

15‧‧‧凸塊電極(第2電極)15‧‧‧ bump electrode (second electrode)

16‧‧‧第2電路構件16‧‧‧The second circuit component

17‧‧‧電路連接部17‧‧‧Circuit Connection

18‧‧‧第1區域18‧‧‧ Zone 1

19‧‧‧第2區域19‧‧‧ Zone 2

20‧‧‧接著劑膜收容套組20‧‧‧ Adhesive Film Containment Kit

21‧‧‧卷軸21‧‧‧Scrolls

22‧‧‧收容構件22‧‧‧ Containment element

23‧‧‧卷芯23‧‧‧ core

24‧‧‧第1側板24‧‧‧ 1st side plate

25‧‧‧第2側板25‧‧‧ 2nd side plate

26‧‧‧軸孔26‧‧‧ Shaft hole

27‧‧‧插入口27‧‧‧Inlet

28‧‧‧視認部28‧‧‧Inspection Department

d1‧‧‧第1接著劑層的厚度(距離)d1‧‧‧thickness (distance) of the first adhesive layer

d2‧‧‧第2接著劑層的厚度(距離)d2‧‧‧thickness of the second adhesive layer (distance)

S‧‧‧第1接著劑層與第2接著劑層的邊界S‧‧‧ The boundary between the first adhesive layer and the second adhesive layer

圖1為表示本發明的一實施形態的電路連接用接著劑膜的示意剖面圖。 圖2為表示本發明的一實施形態的電路連接結構體的示意剖面圖。 圖3(a)、圖3(b)為表示本發明的一實施形態的電路連接結構體的製造步驟的示意剖面圖。 圖4為表示本發明的一實施形態的接著劑膜收容套組的立體圖。FIG. 1 is a schematic cross-sectional view showing an adhesive film for circuit connection according to an embodiment of the present invention. FIG. 2 is a schematic cross-sectional view showing a circuit connection structure according to an embodiment of the present invention. 3 (a) and 3 (b) are schematic cross-sectional views showing manufacturing steps of a circuit connection structure according to an embodiment of the present invention. FIG. 4 is a perspective view showing an adhesive film storage kit according to an embodiment of the present invention.

Claims (10)

一種電路連接用接著劑膜,其包括:含有導電粒子的第1接著劑層、及積層於所述第1接著劑層上的第2接著劑層,且 所述第2接著劑層顯示最低熔融黏度的溫度下的所述第1接著劑層的熔融黏度相對於所述第2接著劑層的所述最低熔融黏度的比為10以上。An adhesive film for circuit connection includes a first adhesive layer containing conductive particles and a second adhesive layer laminated on the first adhesive layer, and the second adhesive layer exhibits the lowest melting. The ratio of the melt viscosity of the first adhesive layer to the minimum melt viscosity of the second adhesive layer at a viscosity temperature is 10 or more. 如申請專利範圍第1項所述的電路連接用接著劑膜,其中所述第1接著劑層包含第1硬化性組成物的硬化物, 所述第1硬化性組成物含有具有自由基聚合性基的自由基聚合性化合物。The adhesive film for circuit connection according to item 1 of the scope of patent application, wherein the first adhesive layer contains a cured product of a first curable composition, and the first curable composition contains a radical polymerizable polymer. Radical polymerizable compound. 如申請專利範圍第1項或第2項所述的電路連接用接著劑膜,其中所述第2接著劑層包含第2硬化性組成物, 所述第2硬化性組成物含有具有自由基聚合性基的自由基聚合性化合物。The adhesive film for circuit connection according to claim 1 or claim 2, wherein the second adhesive layer includes a second curable composition, and the second curable composition includes a radical polymerizer. Radical polymerizable compound. 如申請專利範圍第1項至第3項中任一項所述的電路連接用接著劑膜,其中所述第1接著劑層的厚度為所述導電粒子的平均粒徑的0.2倍~0.8倍。The adhesive film for circuit connection according to any one of claims 1 to 3, wherein the thickness of the first adhesive layer is 0.2 to 0.8 times the average particle diameter of the conductive particles. . 一種電路連接用接著劑膜的製造方法,其包括: 準備步驟,準備第1接著劑層;以及 積層步驟,於所述第1接著劑層上積層包含第2硬化性組成物的第2接著劑層, 所述準備步驟包括硬化步驟,藉由對包含含有導電粒子的第1硬化性組成物的層進行光照射或加熱而使所述第1硬化性組成物硬化,獲得所述第1接著劑層, 所述硬化步驟中,以所述第2接著劑層顯示最低熔融黏度的溫度下的所述第1接著劑層的熔融黏度相對於所述第2接著劑層的所述最低熔融黏度的比為10以上的方式使所述第1硬化性組成物硬化。A method for manufacturing an adhesive film for circuit connection, comprising: a preparing step of preparing a first adhesive layer; and a laminating step of laminating a second adhesive containing a second curable composition on the first adhesive layer. A layer, the preparation step includes a hardening step of hardening the first curable composition by light irradiation or heating of the layer containing the first curable composition containing conductive particles to obtain the first adhesive Layer, in the hardening step, the melt viscosity of the first adhesive layer at a temperature at which the second adhesive layer exhibits the lowest melt viscosity relative to When the ratio is 10 or more, the first curable composition is cured. 如申請專利範圍第5項所述的電路連接用接著劑膜的製造方法,其中所述第1硬化性組成物含有具有自由基聚合性基的自由基聚合性化合物。The method for producing an adhesive film for circuit connection according to claim 5 in the patent application scope, wherein the first curable composition contains a radical polymerizable compound having a radical polymerizable group. 如申請專利範圍第5項或第6項所述的電路連接用接著劑膜的製造方法,其中所述第2硬化性組成物含有具有自由基聚合性基的自由基聚合性化合物。The method for producing an adhesive film for circuit connection according to claim 5 or claim 6, wherein the second curable composition contains a radical polymerizable compound having a radical polymerizable group. 如申請專利範圍第5項至第7項中任一項所述的電路連接用接著劑膜的製造方法,其中所述第1接著劑層的厚度為所述導電粒子的平均粒徑的0.2倍~0.8倍。The method for manufacturing an adhesive film for circuit connection according to any one of claims 5 to 7, wherein the thickness of the first adhesive layer is 0.2 times the average particle diameter of the conductive particles ~ 0.8 times. 一種電路連接結構體的製造方法,其包括:使如申請專利範圍第1項至第4項中任一項所述的電路連接用接著劑膜介於具有第1電極的第1電路構件、與具有第2電極的第2電路構件之間,將所述第1電路構件及所述第2電路構件熱壓接,而使所述第1電極及所述第2電極彼此電性連接的步驟。A method for manufacturing a circuit connection structure, comprising: interposing the adhesive film for circuit connection according to any one of claims 1 to 4 of a patent application scope between a first circuit member having a first electrode, and And a step of thermally crimping the first circuit member and the second circuit member between the second circuit members having the second electrode to electrically connect the first electrode and the second electrode. 一種接著劑膜收容套組,其包括:如申請專利範圍第1項至第4項中任一項所述的電路連接用接著劑膜、及收容所述接著劑膜的收容構件, 所述收容構件具有使得能夠自外部視認所述收容構件的內部的視認部, 所述視認部對波長365 nm的光的透射率為10%以下。An adhesive film storage kit, comprising: the adhesive film for circuit connection according to any one of claims 1 to 4 of the scope of patent application; and a storage member for accommodating the adhesive film. The member has a viewing portion that allows the inside of the storage member to be viewed from the outside, and the viewing portion has a transmittance of light having a wavelength of 365 nm of 10% or less.
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