TW201823893A - Method, system, and programmable logic controller for automatically controlling test of electronic apparatus - Google Patents

Abstract

A method, a system, and a programmable logic controller are provided for automatically controlling the test of electronic apparatus. The system is configured for detecting whether an electronic apparatus tray necessary to be tested is placed on a first conveyor. A pick-and-place system is configured for capturing the electronic apparatus tray necessary to be tested and further placing the electronic apparatus tray to a proper position of a rack of a cabinet test system to execute the test. Meanwhile, the electronic apparatus tray placed on the proper position of the rack is transported to a conveyor with respect to the electronic apparatus tray in accordance a test result.

Description

Program control method, system and programmable logic controller thereof for automatic testing of electronic equipment

The invention relates to the application of automation technology in the field of electronic equipment processing technology, in particular to an automatic control of electronic equipment for testing.

In the electronic device assembly and processing process, for example, the electronic device is a notebook computer, and the system or the preset software is required to be downloaded or the corresponding data is tested before the notebook computer leaves the factory. The existing practice for this process is: manually inserting the notebook computer that needs data download into a data download/test station, and connecting the notebook computer with the data download server or the data test server, and then starting A pre-set download program or test program for automatic download or automatic test, and prompts after completion, and then the worker then removes the data download or test completed notebook to complete the entire process.

The above practices have certain limitations. If the number of electronic devices to be tested is large, the efficiency of such manual operations will be very inefficient and error-prone.

In view of the above-mentioned shortcomings of the prior art, an object of the present invention is to provide an automatic control of an electronic device for testing, which is used to solve the problem that an existing electronic device is inefficient and error-prone by manual operation during data testing or data downloading. problem.

To achieve the above and other related objects, the present invention provides a program control method for an automatic test of an electronic device, comprising the steps of: detecting, by a detection system, an electronic device carrier along a first conveyor belt to a first position a control system activates a first lifting platform adjacent to the first position of the first conveyor belt, lifting the electronic device carrier to a second position, and grasping the second position according to the control system by using a pick and place system The electronic device is mounted on a rack of a rack test system, and one of the connectors of the electronic device tray is electrically connected to the connector on the adapting position of the rack, and the test system is used to start a test servo. Performing at least one test on the electronic device carrier; using the control system to receive a first command, using the pick and place system to extract the electronic setting carrier from the cabinet test system, and placing the third set position, using the The control system activates a second lifting platform adjacent to the third position of the second conveyor belt, placing the electronic device carrier in a fourth position, or utilizing the control system Receiving a second command, using the pick and place system to extract the electronic setting carrier from the cabinet test system, placing it in a fifth position, and using the control system to activate a third position next to the fifth position of the third conveyor belt The lifting platform places the electronic device carrier in a sixth position.

The invention also provides a program control system for automatically testing an electronic device, comprising a cabinet test system and a control system, the rack test system comprising a rack, the rack being provided with a plurality of matching bits, each of the adapting The device is provided with an electronic device carrier for testing. Each of the matching bits is provided with a connector, the connector is connected to a test server, and a first conveyor belt is arranged side by side on either side of the frame. a second conveyor belt and a third conveyor belt. The control system is respectively connected to a detection system and a pick-and-place system and the test server. The control system is configured to: when the detection system detects the electronic device carrier along the first conveyor belt to a first position, Notifying the control system to activate one of the first lifting stations adjacent to the first position of the first conveyor belt, and lifting the electronic equipment carrier to a second position; the pick and place system grabbing the second position according to the control system The electronic device carries the disk to the rack of the rack test system, and the connector of the electronic device carrier is electrically connected to the connector on the matching position of the rack, and the control system activates the electronic device Performing at least one test on the disk; and the control system receives a first command, the pick and place system extracts the electronic setting carrier from the cabinet test system, and places it in a third position, and the control system activates the second conveyor a second lifting platform next to the third position, the electronic device carrier is placed in a fourth position, or the control system receives a second command, the pick and place system takes the electronic setting carrier from the Test system out, placed in a fifth position, the control system activates one beside the fifth position of the third conveyor belt of the third elevators, the electronic device is placed on a platen sixth position.

Based on the above-mentioned necessary technical means, the program control system for automatically testing the electronic device further includes the following preferred technical means. The detection system is an inductive device.

Based on the above-mentioned necessary technical means, the program control system for automatically testing the electronic device further includes the following preferred technical means. The first lifting platform, the second lifting platform and the third lifting platform are respectively a cylinder structure, and can perform an action of jacking up or landing.

Based on the above-mentioned necessary technical means, the program control system for automatically testing the electronic device further includes the following preferred technical means. The pick and place system includes an XYZ three-way structure and a tray picking arm structure. The tray picking arm structure moves to move the XYZ to the three-way structure to determine the position of the electronic device carrier.

Based on the above-mentioned necessary technical means, the program control system for automatically testing the electronic device further includes the following preferred technical means. The tray picking arm structure comprises a boom frame, the rear end of the arm frame is connected to the XYZ three-way structure, and the XYZ is moved to the three-way structure, and the front end of the arm frame is connected to a rotating motor, the rotation A clamping mechanism is connected below the motor, and the clamping mechanism is moved by inserting or pulling out the frame by a front and rear pushing cylinder. The front and rear pushing cylinders are connected to the clamping mechanism and the other end is connected to the rotating motor. .

Based on the above-mentioned necessary technical means, the program control system for automatically testing the electronic device further includes the following preferred technical means. The gripping mechanism has a cantilever roller structure that guides the force when inserting or pulling out the frame.

Based on the above-mentioned necessary technical means, the program control system for automatically testing the electronic device further includes the following preferred technical means. The connector includes at least one network port and a power port.

Based on the above-mentioned necessary technical means, the program control system for automatically testing the electronic device further includes the following preferred technical means. The first command is a test OK command for instructing the pick and place system to place the electronic device carrier into a test OK conveyor belt, and the second conveyor belt is the test OK conveyor belt.

Based on the above-mentioned necessary technical means, the program control system for automatically testing the electronic device further includes the following preferred technical means. The second command is a test NG command for instructing the pick and place system to place the electronic device carrier in a test NG conveyor, the third conveyor being the test NG conveyor.

Based on the above-mentioned necessary technical means, the program control system for automatically testing the electronic device further includes the following preferred technical means. The test NG command is generated when the test server determines that the electronic device carrier network timeout is sent, and sends a first test NG command, or the test NG command is generated in the test server. Sending a second test NG command when the electronic device carrier fails the test, or the test NG command is generated when the test server detects that the electronic device carrier fails to download data at a third time. A third test NG command.

The invention also provides a programmable logic controller (PLC), comprising a memory and a processor. The memory is configured to store a processor executable instruction, the processor configured to execute the processor executable instruction: a detection system detects an electronic device carrier along a first conveyor belt to a first position a control system activates a first lifting platform adjacent to the first position of the first conveyor belt, lifting the electronic device carrier to a second position, a pick and place system, and grasping the second position according to the control system The electronic device carries a tray to a rack of a rack test system, and one of the connectors of the electronic device tray is electrically connected to a connector on an adapting position of the rack, and the control system starts a test server Performing at least one test on the electronic device carrier; and the control system receives a first command, the pick and place system extracts the electronic setting carrier from the cabinet testing system, and places it in a third position, and the control system starts a a second lifting platform adjacent to the third position of the second conveyor belt, placing the electronic device carrier in a fourth position, or the control system receiving a second command, the pick and place system setting the electronic device Platen withdrawn from the test system cabinet, placed in a fifth position, the control system activates one beside the fifth position of the third conveyor belt a third elevators, the electronic device is placed on a platen sixth position.

As described above, the present invention has the following advantageous effects: the present invention replaces the existing manual pick-and-place electronic device by the pick-and-place system, and sets a plurality of transmission belts on the side of the rack to be tested to carry the electronic devices that are placed before and after the test. The discs are placed in different conveyor belts to make the flow classification of the electronic equipment in the test process clear and do not interfere with each other, thereby improving the overall efficiency of the test, especially when performing large-scale tests.

The specific embodiments of the present invention will be further described by the following examples and drawings.

The embodiments of the present invention are described below by way of specific embodiments, and those skilled in the art can readily understand other advantages and functions of the present invention from the disclosure.

It should be understood that the structures, the proportions, the sizes, and the like, which are illustrated in the specification of the present specification, are only used to clarify the contents disclosed in the specification for understanding and reading by those skilled in the art, and are not intended to limit the implementation of the present invention. The conditions are limited, so it is not technically meaningful. Any modification of the structure, change of the proportional relationship or adjustment of the size should remain in the present invention without affecting the effects and the achievable purposes of the present invention. The disclosed technical content is within the scope of the disclosure. In the meantime, the terms "upper", "lower", "left", "right", "intermediate" and "one" as used in this specification are also for convenience of description, and are not intended to limit the present. The scope of the invention can be implemented, and the change or adjustment of the relative relationship is considered to be within the scope of the invention.

Referring to the first figure, the embodiment provides a program control system for automatically testing an electronic device, which is used for automatically controlling the process of performing data testing or data downloading on/off the electronic device. As shown in the figure, the program controls The system includes: a rack test system 8 including a rack 81, and a plurality of adapting positions 82 for receiving an electronic device carrier 4 for testing. Each adapting position 82 is provided with a connector 83. The controller 83 is connected to the test server 84; and the first conveyor belt 5, the second conveyor belt 6 and the third conveyor belt 7 are arranged side by side on either side of the rack 81 of the cabinet test system 8; the control system 2 is respectively connected to a detection The system 1 and a pick-and-place system 3 and a test server 84 are configured to: detect the system 1 and notify the control system 2 to start when the electronic device carrier 4 is detected along the first conveyor belt 5 to the first position a first lifting platform 51 adjacent to the first position of the first conveyor belt 5, lifting the electronic device carrier 4 to a second position; the pick and place system 3, according to the control system 2, grasping the second position Electronic equipment carrier 4 to cabinet test system 8 a rack 81, a connector of the electronic device carrier 4 is electrically connected to one of the connectors 81 of the rack 81, the control system 2 activates the electronic device carrier 4 and performs at least one test; and the control system 2 Receiving a first command, the pick-and-place system 3 withdraws the electronic setting carrier from the cabinet testing system 8 and places it in a third position, and the control system 2 activates one of the third positions of the second conveyor belt 6 The second lifting platform 61 is configured to place the electronic device carrier 4 in a fourth position, or the control system 2 receives a second command, and the pick and place system 3 withdraws the electronic setting carrier from the cabinet testing system 8. Placed in a fifth position, the control system 2 activates a third lifting platform 71 adjacent to the fifth position of the third conveyor belt 7 to place the electronic device carrier 4 in a sixth position.

In the above program control system, the detection system 1 detects whether there is an electronic device carrier 4 on the first conveyor belt 5 to be tested, and the pick-and-place system 3 is responsible for capturing the electronic device carrier 4 that needs to be tested. And automatically put it into the rack 81 of the rack test system 8 to test the adapter 82; at the same time, according to the test results, the electronic device tray 4 on the adapting bit 82 of the rack 81 is extracted. And put it on the corresponding conveyor belt and send it out. The above process includes the racking process and the racking process of the electronic device carrier 4, which are automatically implemented through the cooperation of the above systems, and the electronic device carrier 4 is dedicated through the shelf or the shelf. The transmissions are transmitted and do not interfere with each other, so the entire automatic control process is extremely efficient.

In a specific embodiment, the first conveyor belt 5 can be used as a transmission belt to be tested to specifically transmit the electronic equipment carrier 4 to be tested. Accordingly, the detection system 1 detects that the electronic equipment carrier 4 is along the first conveyor belt. 5 when the first position is reached, the control system 2 is notified to activate the first lifting platform 51 disposed beside the first position of the first conveyor belt 5 to lift the electronic device carrier 4 to the second position for capturing the electronic device. The mating position 82 on the disc 4 to the frame 81 is ready.

Wherein, the first position is a lifting position on the conveyor to be tested, the second position is a waiting position on the conveyor to be tested, and the electronic equipment carrier 4 is lifted from the first position to the second position by the first lifting platform 51, such that The electronic device carrier 4 can be detached from the first conveyor belt 5 to a position waiting for the grabbing system to be grasped, in order to allow the other electronic device carrier 4 on the first conveyor belt 5 to continue to pass the first position, in the electronic device The carrier 4 does not interfere with the rear electronic device carrier 4 while waiting to be grasped. In practice, the first conveyor belt 5 can have a plurality of lifting platforms, so that the electronic device carrier 4 can pass through The elevator that is being occupied does not need to stay, and can continue to flow along the first conveyor belt 5 to the next free elevator platform, thereby ensuring the efficiency of the test.

Furthermore, the above-mentioned second conveyor belt 6 can be used as a test OK conveyor belt for exclusively transmitting the electronic equipment carrier 4 for testing OK. Based on this, the first instruction is a test OK command, and when receiving the test OK command, the control system starts the crawling system to put the electronic device carrier 4 into the test OK conveyor and send it.

Specifically, the test OK command is generally issued by the test server 84 when the entire test is successfully completed.

Similarly, the third conveyor belt 7 described above can be used as a test NG conveyor belt for specifically transmitting the electronic equipment carrier 4 for testing NG. Based on this, the second instruction is a test NG command, and when receiving the test NG command, the control system starts the crawling system to put the electronic device carrier 4 into the test NG conveyor and send it.

Specifically, the test NG command is generally issued when the test fails. In an actual application, the test process may have three judging steps: performing a network timeout judgment at the first time, and running a test test at the second time, in the third Time for data download detection. As long as the result of any of the above steps is negative, a test NG command can be issued by the test server 84.

For example, the test server determines that the electronic device carrier network timeout is sent, and sends a first test NG command; and the test server detects that the electronic device carrier fails the test at the second time. And sending the second test NG command; and sending the third test NG command when the test server fails to detect the electronic device carrier for data download failure at the third time.

Specifically, at least one lifting platform is disposed on each conveyor belt, for example, a first lifting platform is disposed adjacent to the first position of the first conveyor belt, and a second lifting platform is disposed adjacent to the third position of the second conveyor belt. A third lifting platform is provided beside the fifth position of the conveyor belt. Wherein, the third position is a to-be-received position of the test OK conveyor belt, the fourth position is a lifting position of the test OK conveyor belt, the fifth position is a to-be-received position of the test NG conveyor belt, and the sixth position is a lifting and lowering of the test NG conveyor belt Bit.

In a specific embodiment, the lifting platform may be a cylinder mechanism that performs a jacking or landing action. Corresponding to the above-mentioned position to be taken and the lifting position, the position after the cylinder mechanism performs the fixed lifting action is the position to be taken, and the position after the cylinder mechanism performs the fixed landing action is the lifting position.

In a specific embodiment, the detecting system 1 is an inductive device disposed beside each lifting platform, and may specifically be a sensor.

In a specific implementation, the pick-and-place system 3 is disposed above each conveyor belt, and the pick-and-place system 3 may specifically include an XYZ-direction three-way structure and a tray pick-and-place arm structure. According to the XYZ-direction three-way structure, the pick-and-place system 3 can move in the X, Y, and Z directions of the space. Through this movement, the pick and place system 3 can be positioned to any position on the rack 81 to facilitate accurate placement of the electronic device into the rack 81 or extraction. Rack 81. In addition, the tray pick-and-place arm structure can place the electronic device carrier 4 into the rack 81 or pull out the rack 81.

Specifically, referring to the second figure, the tray picking arm structure 31 can be implemented as follows: the tray picking arm structure 31 includes a boom 311, and the rear end of the arm frame 311 is connected to the XYZ three-way structure. The XYZ is moved to the three-way structure. The front end of the arm frame 311 is connected to a rotating motor 312. The lower end of the rotating motor 312 is connected with a clamping mechanism 313. The upper part of the clamping mechanism 313 is connected to the electronic device. A front and rear push cylinder 314 is moved in the frame direction, and at least one transfer tray motor 316 is disposed on each side of the chucking mechanism 313 in the direction of pushing/extracting the rack, and the electronic device in the gripping mechanism 313 is pushed in/ A sensing device 315 is disposed on each of the front and rear ends of the racking direction.

In detail, in conjunction with the second figure, the clamping mechanism 313 is a two-cantilever roller structure, and the two cantilever roller structures are controlled by a cylinder to realize the opening or closing action. When the electronic device carrier is grasped, the cylinder will first The two cantilever roller structures are flared to enclose the electronic device carrier, and then the two cantilever roller structures are gathered by the cylinder to clamp the electronic device carrier.

In a specific embodiment, in conjunction with the transfer tray motor 316 on the gripping mechanism 313, the transfer tray motor 316 can be an electric motor coupled to a roller that is juxtaposed with the two cantilever roller structures. Since the roller and the two cantilever roller structures are in contact with the edge of the electronic device carrier, when the transfer tray motor 316 is activated, the edge of the electronic device carrier is moved between the two cantilever roller structures, that is, the two cantilever roller structures are inserted or Guide the force when pulling out the frame.

Based on the above-described tray pick-and-place arm structure 31, the process of placing the electronic device carrier on the rack can be implemented by picking up the electronic device to be taken through the pick-up mechanism 313 on the tray pick-up arm structure 31. The device carries the disk and transports the electronic device carrier to the matching position of a specified coordinate position on the frame through the XYZ to the three-way structure. At this time, the clamping mechanism 313 is rotated by the rotating motor 312 on the arm frame 311. The electronic device carrier is facing the matching position, and then the front and rear pushing cylinders 314 above the clamping mechanism 313 pushes the clamping mechanism 313 toward the matching position, and the conveying tray motor 316 on the clamping mechanism 313 starts to work. In this cooperation, the electronic device carrier is slowly fed into the matching position. When the sensing device at the front end of the clamping mechanism 313 does not detect the electronic device carrier, it indicates that the electronic device carrier has been completely fed into the adaptation. In the position, the cylinder 314 is then pushed back and forth to the clamping mechanism 313 in the opposite direction, and the rotation motor 312 is stopped, so that the process of placing the electronic device carrier into the rack is completed to proceed to the next working process.

Similarly, based on the tray pick-and-place arm structure 31, if the electronic device carrier is to be pulled out of the rack, the operation may be reversed according to the above-mentioned insertion process, except that the extraction process is performed by the gripping mechanism 313. The sensing device at the back end detects whether the electronic device carrier has completely extracted the matching bit, and the remaining repetitions are not described.

In a specific embodiment, the matching position on the rack of the cabinet test system is provided with a guiding structure for introducing the electronic device carrier, and the guiding mechanism can be a guiding slot.

In addition, the connector on the adaptation bit includes at least one network port and one power port.

According to another aspect of the present invention, based on the above program control system, in the embodiment, a program control method for testing an electronic device is also provided. Referring to the third figure, the program control method includes:

S101, the control process of the electronic device shelf:

When the detecting system detects the electronic device carrier along the first conveyor belt to the first position, the first lifting platform next to the first position of the first conveyor belt is activated by the control system, and the electronic equipment carrier is raised to the second position. Location, and

Receiving, by the pick-and-place system, the electronic device carrier of the second location to the rack of the rack test system according to the control system, the connector of the electronic device carrier is electrically connected to the connector of the rack, and the control is utilized The system activates the electronic device carrier and performs at least one test.

S102, the control process of the electronic device off the shelf:

Receiving, by the control system, a first command, the pick-and-place system extracting the electronic setting carrier from the cabinet testing system, placing the third position, and using the control system to activate the second position next to the third position of the second conveyor a lifting platform, the electronic device carrier is placed in the fourth position,

Alternatively, the control system receives a second command, the pick and place system extracts the electronic setting carrier from the cabinet test system, places it in a fifth position, and uses the control system to activate the fifth position of the third conveyor belt. The third lifting platform places the electronic device carrier in the sixth position.

According to the above program control method, under the cooperative control of the detection system, the pick-and-place system and the control system, the electronic device carrier (with the electronic device loaded thereon) can be sent to the rack of the rack test system for automatic testing, and can According to the test result, the electronic device is taken out from the rack and sent to the corresponding conveyor belt, and sent out, thereby realizing automatic control of the entire test process and improving test efficiency.

It is to be noted that the technical solutions in the present embodiment are based on the foregoing embodiments, and therefore, the technical content is repeated, and details are not described herein.

Further, according to still another aspect of the present invention, the control process in the foregoing embodiments may be executed by a programmable logic controller (PLC) in a practical application, so the embodiment provides a The programmable logic controller, see the fourth figure, includes a memory 91 and a processor 92. The memory 91 is configured to store a processor executable instruction, and the processor 92 is configured to execute the processor executable instruction: when the detecting system detects the electronic device carrier along the first conveyor belt to the first position, Notifying the control system to activate the first lifting platform adjacent to the first position of the first conveyor belt, lifting the electronic device carrier to the second position; picking up and dropping the system, and capturing the electronic device in the second position according to the control system Carrying the disk to the rack of the rack test system, the connector of the electronic device carrier is electrically connected to the connector of the rack, the control system starts the electronic device carrier and performs at least one test; and the control system receives the first In an instruction, the pick-and-place system extracts the electronic setting carrier from the cabinet test system and places it in a third position, the control system activates a second lifting platform adjacent to the third position of the second conveyor belt, and the electronic device carries The disk is placed in the fourth position, or the control system receives a second command, and the pick and place system extracts the electronic setting carrier from the cabinet test system and places it in the fifth position. A third control system activates the fifth position beside the lifting platform of the third conveyor belt, the electronic device is placed in the sixth position of the platen.

According to the above programmable logic controller, by controlling the detection system and the pick-and-place system, the electronic device carrier (with the electronic device loaded thereon) can be sent to the rack of the rack test system for automatic testing, and can be tested according to the test. As a result, the electronic device is taken out from the rack and sent to the corresponding conveyor belt for delivery, thereby realizing automatic control of the entire test process and improving test efficiency.

In summary, the present invention replaces the existing manual pick-and-place electronic device through the pick and place system, and sets a plurality of transport belts on the side of the rack to be tested to put the electronic device trays placed before and after the test into different conveyor belts. The classification of electronic devices during the testing process is clearly defined and does not interfere with each other, thereby improving the overall efficiency of the test, especially when performing large-scale tests. Therefore, the present invention effectively overcomes various shortcomings in the prior art and has high industrial utilization value.

The above-described embodiments are merely illustrative of the principles of the invention and its effects, and are not intended to limit the invention. Modifications or variations of the above-described embodiments may be made by those skilled in the art without departing from the spirit and scope of the invention. Therefore, all equivalent modifications or changes made by those skilled in the art without departing from the spirit and scope of the invention will be covered by the appended claims.

1‧‧‧Detection system
2‧‧‧Control system
3‧‧‧ pick and place system
31‧‧‧Tray pick and place arm structure
311‧‧‧Boom
312‧‧‧Rotary motor
313‧‧‧Clamping mechanism
314‧‧‧ pushing cylinders
315‧‧‧Induction equipment
316‧‧‧Transport tray motor
4‧‧‧Electronic equipment carrier
5‧‧‧First conveyor belt
51‧‧‧First lifting platform
6‧‧‧Second conveyor
61‧‧‧Second lift
7‧‧‧ Third conveyor belt
71‧‧‧ Third lifting platform
8‧‧‧Cabinet test system
81‧‧‧Rack
82‧‧‧ Adaptation
83‧‧‧Connector
84‧‧‧Test server
9‧‧‧PLC controller
91‧‧‧ memory
92‧‧‧ processor
C‧‧‧Control transmission path
S‧‧‧ signal transmission path
T‧‧‧ communication path

The first figure is a schematic diagram of the principle of a program control system for automatically testing an electronic device according to an embodiment of the present invention. The second figure is a schematic diagram of the tray pick-and-place arm structure of the pick and place system in the first embodiment in an embodiment. The third figure is a flowchart of a program control method for automatically testing an electronic device according to the present invention. The fourth figure is a schematic diagram of a programmable logic controller of the present invention.

Claims (12)

A program control method for an automatic test of an electronic device, comprising the steps of: using a detection system to detect an electronic device carrier along a first conveyor belt to a first position, and using a control system to activate the first conveyor belt a first lifting platform next to the first position, the electronic device carrier is raised to a second position; and the electronic device carrier of the second position is captured to a cabinet testing system according to the control system by using a pick-and-place system a rack, the connector of the electronic device carrier is electrically connected to the connector on the adapting position of the rack, and the control system is used to start a test server to perform at least one test on the electronic device carrier And when the control system receives a first command, the electronic setting carrier is extracted from the cabinet testing system by the pick and place system, placed in a third position, and the second conveyor belt is activated by the control system. a second lifting platform next to the three positions, the electronic device carrier is placed in a fourth position; when the control system receives a second command, the power is taken by the pick and place system The setting carrier is extracted from the cabinet testing system, placed in a fifth position, and the control system is used to activate a third lifting platform adjacent to the fifth position of the third conveyor belt, and the electronic device carrier is placed in a sixth position. position. A program control system for automatically testing an electronic device, comprising: a rack test system, comprising a rack, the rack is provided with a plurality of matching bits, each of which is adapted to receive an electronic device carrier for testing Each of the adapters is provided with a connector, the connector is connected to a test server, and a first conveyor belt, a second conveyor belt and a third conveyor belt are arranged side by side on either side of the rack; a control system is respectively connected to a detection system and a pick-and-place system and the test server, the control system is configured to: when the detection system detects the electronic device carrier along the first conveyor belt to a first position Notifying the control system to activate one of the first lifting stations adjacent to the first position of the first conveyor belt, lifting the electronic equipment carrier to a second position; the pick and place system grasping the second position according to the control system The electronic device carries the disk to the rack of the rack test system, and the connector of the electronic device carrier is electrically connected to the connector on the matching position of the rack, and the control system activates the electronic device Performing at least one test on the disk; wherein, when the control system receives a first command, the pick and place system extracts the electronic setting carrier from the cabinet test system and places it in a third position, and the control system starts the first a second lifting platform adjacent to the third position of the second conveyor belt, the electronic device carrier is placed in a fourth position; and when the control system receives a second command, the pick and place system removes the electronic setting carrier The cabinet test system is withdrawn and placed in a fifth position. The control system activates a third lift station adjacent to the fifth position of the third conveyor belt to place the electronic device carrier in a sixth position. The program control system for automatically testing an electronic device according to claim 2, wherein the detection system is a sensing device. The program control system for automatically testing the electronic device according to claim 2, wherein the first lifting platform, the second lifting platform and the third lifting platform are respectively a cylinder structure for performing jacking Or the action of landing. The program control system for automatically testing an electronic device according to claim 2, wherein the pick and place system comprises an XYZ three-way structure and a tray picking arm structure, and the tray picking arm structure is transmitted through the The XYZ moves to the three-way structure to determine the position at which the electronic device carrier is accessed. The program control system for automatically testing an electronic device according to claim 5, wherein the tray picking arm structure comprises a boom, and a rear end of the boom is connected to the XYZ three-way structure. The XYZ is moved to the three-way structure, the front end of the boom is connected to a rotating motor, and the rotating motor is movably connected to a clamping mechanism. The clamping mechanism is inserted or pulled out along the frame by a front and rear pushing cylinder control. The direction is moved, and one end of the front and rear push cylinder is connected to the clamping mechanism, and the other end is connected to the rotating motor. The program control system for automatically testing an electronic device according to claim 6, wherein the clamping mechanism has a cantilever roller structure for guiding a force when the frame is inserted or removed. The program control system for automatically testing an electronic device according to claim 2, wherein the connector comprises at least one network port and one power port. The program control system for performing automatic test on an electronic device according to any one of claims 2-8, wherein the first command is a test OK command for instructing the pick and place system to place the electronic device carrier A test OK conveyor belt, the second conveyor belt being the test OK conveyor belt. The program control system for automatically testing an electronic device according to claim 9, wherein the second command is a test NG command for instructing the pick and place system to place the electronic device carrier into a test NG conveyor. The third conveyor belt is the test NG conveyor belt. The program control system for automatically testing an electronic device according to claim 10, wherein the test NG command is generated when the test server determines that the electronic device carrier timeout expires at a first time. a first test NG command; the test NG command is generated when the test server detects a failure of the electronic device carrier to pass a test at a second time, and sends a second test NG command; the test NG command is generated from the test servo When detecting the electronic device carrier for data download failure at a third time, the device sends a third test NG command. A Programmable Logic Controller (PLC) includes: a memory for storing a processor executable instruction; and a processor configured to execute the following processor executable instruction: a detection system When detecting an electronic device carrier along a first conveyor belt to a first position, a control system activates a first lifting platform adjacent to the first position of the first conveyor belt, and lifts the electronic equipment carrier to a first a two-position, a pick-and-place system that captures the electronic device carrier of the second location to a rack of a cabinet test system according to the control system, and one of the connectors of the electronic device carrier is electrically connected to one of the racks Adapting a connector on the bit, the control system initiating a test server to perform at least one test on the electronic device carrier; wherein, when the control system receives a first command, the pick and place system loads the electronic device The disk is withdrawn from the cabinet test system and placed in a third position, the control system activates a second lifting station adjacent to the third position of the second conveyor belt, and the electronic device is placed on the tray In a fourth position; when the control system receives a second command, the pick and place system extracts the electronic setting carrier from the cabinet test system and places it in a fifth position, and the control system activates a third conveyor belt A third lifting platform next to the fifth position places the electronic device carrier in a sixth position. 【figure】