TW201819694A - Silicon ingot growth crucible with patterned protrusion structured layer - Google Patents

Silicon ingot growth crucible with patterned protrusion structured layer Download PDF

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TW201819694A
TW201819694A TW106116365A TW106116365A TW201819694A TW 201819694 A TW201819694 A TW 201819694A TW 106116365 A TW106116365 A TW 106116365A TW 106116365 A TW106116365 A TW 106116365A TW 201819694 A TW201819694 A TW 201819694A
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particles
crucible
layer
silicon
patterned
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TWI798177B (en
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阿布 U. S. 庫瑪倫
吳育豪
唐琦
比諾提 J. J. 里費洛
黃福佳
宋輝光
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Rec太陽能私人有限公司
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    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B35/00Apparatus not otherwise provided for, specially adapted for the growth, production or after-treatment of single crystals or of a homogeneous polycrystalline material with defined structure
    • C30B35/002Crucibles or containers
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B11/00Single-crystal growth by normal freezing or freezing under temperature gradient, e.g. Bridgman-Stockbarger method
    • C30B11/002Crucibles or containers for supporting the melt
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B13/00Single-crystal growth by zone-melting; Refining by zone-melting
    • C30B13/14Crucibles or vessels
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B15/00Single-crystal growth by pulling from a melt, e.g. Czochralski method
    • C30B15/10Crucibles or containers for supporting the melt
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B29/00Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
    • C30B29/02Elements
    • C30B29/06Silicon
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F27FURNACES; KILNS; OVENS; RETORTS
    • F27BFURNACES, KILNS, OVENS, OR RETORTS IN GENERAL; OPEN SINTERING OR LIKE APPARATUS
    • F27B14/00Crucible or pot furnaces
    • F27B14/08Details peculiar to crucible or pot furnaces
    • F27B14/10Crucibles
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F27FURNACES; KILNS; OVENS; RETORTS
    • F27BFURNACES, KILNS, OVENS, OR RETORTS IN GENERAL; OPEN SINTERING OR LIKE APPARATUS
    • F27B14/00Crucible or pot furnaces
    • F27B14/08Details peculiar to crucible or pot furnaces
    • F27B14/10Crucibles
    • F27B2014/104Crucible linings

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Mechanical Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Silicon Compounds (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
  • Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)

Abstract

A crucible for growing silicon ingots is proposed. The crucible comprises a vessel having a bottom wall and side walls surrounding an inner portion of the vessel. A coating layer is applied to inner surfaces of the bottom wall and the side walls, the coating layer comprising a temperature-resistant material compatible with ingot growth from molten silicon such as silicon nitride. Furthermore, a patterned protrusion layer is applied at the inner surface of the bottom wall. The patterned protrusion layer comprises a matrix consisting of a temperature-resistant material compatible with ingot growth from molten silicon such as silicon nitride. Furthermore, the patterned protrusion layer further comprises particles of a nucleation enhancing material such as silica, the particles locally protruding from the matrix. Accordingly, the protruding particles may generate a pattern of multiple nucleation points during crystal growth of the ingot. Due to such multiple nucleation points, a dislocation density defect propagation towards a top may be reduced during crystal growth such that e.g. solar cells produced with wafers sliced from the resulting ingot may have an improved conversion efficiency.

Description

具經圖案化之突出結構層的矽鑄塊生長坩堝Silicon ingot growth crucible with patterned protruding structure layer

發明領域 本發明是關於一種用於生長矽晶體鑄塊的坩堝,該矽晶體鑄塊可被使用於例如供製造用於太陽能電池產製的多結晶體矽晶圓。本發明亦關於一種用於製備一坩堝的方法。FIELD OF THE INVENTION The present invention relates to a crucible for growing silicon crystal ingots, which can be used, for example, in the manufacture of polycrystalline silicon wafers for solar cell production. The invention also relates to a method for preparing a crucible.

發明背景Background of the invention

太陽能電池(Solar cells)是用於將光能轉變為電能的光伏裝置(photovoltaic device)。太陽能電池一般是以一半導體基板(semiconductor substrate)為基礎。大多數市面上可獲得的太陽能電池是使用一矽基板(silicon substrate,如一矽晶圓)所製造。Solar cells are photovoltaic devices used to convert light energy into electrical energy. Solar cells are generally based on a semiconductor substrate. Most commercially available solar cells are manufactured using a silicon substrate (such as a silicon wafer).

矽晶圓一般是藉由自一固態矽塊(silicon block)切割(slicing)或鋸切(sawing)成薄片所製成。該矽塊通常是藉由熔化經純化的矽以及接著固化(solidifying)該熔融物(melt)所製成。依據物理條件,該固化可能會產生一單晶體(mono-crystalline)矽塊或一多晶體(multi-crystalline, mc-Si)或複晶體(polycrystalline)矽塊。Silicon wafers are generally made by slicing or sawing a wafer from a solid silicon block. The silicon block is typically made by melting purified silicon and then solidifying the melt. Depending on the physical conditions, the curing may result in a mono-crystalline silicon block or a multi-crystalline (mc-Si) or polycrystalline silicon block.

多晶體矽在多數情況下是藉由將一液態矽熔融物(liquid silicon melt)填充(filling)或澆鑄(casting)至一特定的坩堝(crucible)內,並接著藉由以一特定地經控制的方法予以冷卻而固化該熔融物。一般而言,在該固化過程(solidification process)期間的物理條件可顯著地影響所形成之晶體矽塊的物理特性。該晶體矽塊亦被稱為矽鑄塊(silicon ingot)。Polycrystalline silicon is, in most cases, filled or casted into a specific crucible by a liquid silicon melt, and then controlled by a specific The method is followed by cooling to solidify the melt. In general, physical conditions during the solidification process can significantly affect the physical characteristics of the crystalline silicon blocks formed. This crystalline silicon block is also called a silicon ingot.

傳統上,被用來供生長矽鑄塊 的坩鍋包含一自一諸如氧化矽(silica)[亦被稱為石英坩堝(quartz crucible)]、石墨(graphite)、碳化矽(silicon carbide)或類似者之高度耐熱材料所製成的容器。在多數情況下,此容器的表面是被塗佈以額外層,用以作為例如供防止任何汙染物自該容器擴散進入極熱的矽熔融物內的阻障壁(barriers)。經塗佈層亦被提供來簡化該鑄塊於固化後自該坩堝的一脫模過程(release)。Traditionally, the crucibles used to grow silicon ingots consisted of materials such as silica [also known as quartz crucible], graphite, silicon carbide or similar Made of highly heat resistant materials. In most cases, the surface of this container is coated with an additional layer to serve as, for example, barriers to prevent any contaminants from diffusing from the container into the extremely hot silicon melt. A coated layer is also provided to simplify a release of the ingot from the crucible after curing.

發明概要Summary of invention

對於一經改良的用於生長矽鑄塊的坩堝,尤其是能夠生成具有較佳的物理特性的鑄塊之坩堝,可能仍存在一需求。特別地,對於一經改良且利用其可使矽鑄塊被溶鑄,並以該鑄塊為基礎而可製成用於高效能太陽能電池的矽晶圓之坩堝,可能仍存在一需求。此外,對於用於製備該坩堝之較佳的方法,可能仍存在一需求。There may still be a need for an improved crucible for growing silicon ingots, especially crucibles capable of generating ingots with better physical characteristics. In particular, there may still be a need for a crucible that has been improved and can be used to melt a silicon ingot and use the ingot as a basis to form a silicon wafer for high-performance solar cells. In addition, there may still be a need for a better method for preparing the crucible.

該等需求可利用根據獨立項之該坩堝及該方法來達成。較佳的實施例將在該等附屬項及在本說明書中被界定。These requirements can be fulfilled using the crucible and the method under separate terms. Preferred embodiments will be defined in these subsidiary items and in this specification.

依據本發明的一第一個方面,一用於生長矽鑄塊的坩堝被提出。該坩堝包含一容器,其具有一底壁以及圍繞該容器的一內部的側壁。該坩堝還包含一塗佈層(coating layer),其被施加至該底壁以及該側壁的內表面。該塗佈層含有一可與自熔融矽生長出鑄塊相容的耐熱材料,諸如例如氮化矽(silicon nitride)。該坩堝還包含一經圖案化的突出層(patterned protrusion layer),其被施加於該底壁的內表面。該經圖案化的突出層含有一由可與自熔融矽(molten silicon)生長出鑄塊相容的耐熱材料(temperature-resistant material)[諸如例如氮化矽]所組成的基材(matrix)。該經圖案化的突出層還含有成核促進材料(nucleation enhancing material)的顆粒,這些顆粒局部地自該經圖案化的突出層的該基材突出。According to a first aspect of the present invention, a crucible for growing a silicon ingot is proposed. The crucible includes a container having a bottom wall and a side wall surrounding an interior of the container. The crucible also includes a coating layer that is applied to the bottom wall and the inner surface of the side wall. The coating layer contains a heat-resistant material that is compatible with ingots grown from molten silicon, such as, for example, silicon nitride. The crucible also includes a patterned protrusion layer that is applied to the inner surface of the bottom wall. The patterned protruding layer contains a matrix composed of a temperature-resistant material [such as, for example, silicon nitride] compatible with ingots grown from molten silicon. The patterned protruding layer also contains particles of a nucleation enhancing material, the particles partially protruding from the substrate of the patterned protruding layer.

依據本發明的一第二個方面,一製備一用於生長矽鑄塊的坩堝的方法被提出。該方法包含至少下列步驟,較佳地是以該指定順序:首先,一容器被提供,其具有一底壁以及圍繞該容器的一內部的側壁。接著,一塗佈層被施加至該底壁以及該側壁的內表面。此塗佈層含有一可與自熔融矽生長出鑄塊相容的耐熱材料,諸如例如氮化矽。一耐熱材料應能耐受高達至少1000℃的溫度,較佳的是至少1400℃或甚至至少1500℃,而不會有顯著地受損(damaged)或變質(deteriorated)。隨後,一經圖案化的突出層被施加至該底壁的內表面上,亦即在先前被施加於此底壁上的該塗佈層之上。該經圖案化的突出層含有一由可與自熔融矽生長出鑄塊相容的耐熱材料(諸如氮化矽)所組成的基材。此外,該經圖案化的突出層含有成核促進材料的顆粒。其中,該經圖案化的突出層是以此方式被施加,以及該等顆粒適用以使得該等顆粒局部地自該基材突出。According to a second aspect of the present invention, a method for preparing a crucible for growing a silicon ingot is proposed. The method includes at least the following steps, preferably in the specified order: first, a container is provided having a bottom wall and a side wall surrounding the interior of the container. Next, a coating layer is applied to the bottom wall and the inner surface of the side wall. This coating layer contains a heat-resistant material compatible with ingots grown from molten silicon, such as, for example, silicon nitride. A heat-resistant material should be able to withstand temperatures up to at least 1000 ° C, preferably at least 1400 ° C or even at least 1500 ° C, without significant damage or deterioration. Subsequently, a patterned protruding layer is applied to the inner surface of the bottom wall, that is, over the coating layer previously applied to the bottom wall. The patterned protruding layer contains a substrate composed of a heat-resistant material, such as silicon nitride, compatible with ingots grown from molten silicon. In addition, the patterned protruding layer contains particles of a nucleation promoting material. Wherein, the patterned protruding layer is applied in this manner, and the particles are adapted so that the particles locally protrude from the substrate.

相關於本發明實施例的原理可被理解為下列想法與認知的基礎,尤其是並且不對本發明的範疇產生限制。The principles related to the embodiments of the present invention can be understood as the basis of the following ideas and cognitions, in particular and without limiting the scope of the present invention.

如同介紹部分所指出的,被發現的是:一含有一耐熱材料的一坩堝的一容器的塗佈壁因多種理由而可能是有益的。特別地,該塗佈層可防止汙染物自該容器擴散至一被澆鑄入該坩堝內的熱矽熔融物中。此外,該塗佈層可做為一脫模層(release layer)來簡化該經固化的矽鑄塊自該坩堝的一脫模過程。為此目的,該塗佈層典型地是諸如在與一液態矽熔融物接觸時形成一非-濕潤劑(non-wetting agent)而被製成。舉例來說,一含有氮化矽(例如以一氮化矽粉末的形式)的塗佈層已經被證實可針對該坩堝的容器提供良好的保護以及脫模特性(releasing characteristics)。因此,該容器的該等壁的所有內表面(亦即指向該容器的該內部並且因而接觸到一被澆鑄至該容器內的熱矽熔融物的表面)是較佳地被塗佈該塗佈層。As pointed out in the introduction, it was discovered that a coated wall of a container containing a crucible of a heat-resistant material may be beneficial for a variety of reasons. In particular, the coating layer can prevent contaminants from diffusing from the container into a hot silicon melt that is cast into the crucible. In addition, the coating layer can be used as a release layer to simplify a demolding process of the cured silicon ingot from the crucible. For this purpose, the coating is typically made such as by forming a non-wetting agent when in contact with a liquid silicon melt. For example, a coating layer containing silicon nitride (eg, in the form of a silicon nitride powder) has been proven to provide good protection and releasing characteristics for the container of the crucible. Therefore, all the inner surfaces of the walls of the container (that is, the surfaces that point to the interior of the container and thus contact a hot silicon melt that is cast into the container) are preferably coated with the coating Floor.

然而,已被發現的是:在上述經塗佈的容器內熔鑄而成的矽鑄塊當被用來切割成供用於矽太陽能電池產製的矽晶圓時可能具有一非-最佳的特性(non-optimal characteristics)。However, it has been discovered that silicon ingots that are melt-cast in the coated containers described above may have a non-optimal characteristic when used to cut silicon wafers for silicon solar cell production. (non-optimal characteristics).

意外地,現在已被發現的是:提供一具有一經圖案化的突出層被施加於其上之該容器的底壁的內表面,可以一種正向的方式影響所形成的矽鑄塊的特性。亦即利用自該矽鑄塊切割成的晶圓所製成的太陽能電池可具有一經提升的效率。特別地,被假定的是:該經圖案化的突出層可改變於該容器的內表面的一表面型態(surface morphology)[例如增加一粗糙度(roughness)]。此外,該經圖案化的突出層可在一垂直溫度梯度(vertical temperature gradient)是高的時候造成局部的溫度不均勻性(temperature non-uniformities)。額外地,該經圖案化的突出層可包括在該基材上隨機地分布的(randomly distributed)成核促進顆粒,其可作為潤濕點(wetting points),藉此改變或改善潤濕特性以幫助該矽成核(nucleate)。Surprisingly, it has now been discovered that providing an inner surface with a bottom wall of the container to which a patterned protruding layer is applied can affect the properties of the formed silicon ingot in a positive manner. That is, a solar cell made from a wafer cut from the silicon ingot can have an improved efficiency. In particular, it is assumed that the patterned protruding layer may be changed to a surface morphology [eg, to increase a roughness] of the inner surface of the container. In addition, the patterned protruding layer may cause local temperature non-uniformities when a vertical temperature gradient is high. Additionally, the patterned protruding layer may include randomly distributed nucleation promoting particles on the substrate, which may serve as wetting points, thereby changing or improving wetting characteristics to Help the silicon nucleate.

該塗佈層可直接地被沉積在該坩堝中一個或多個的壁上。該經圖案化的突出層可直接地被沉積在其下方的該塗佈層上,亦即可與該塗佈層呈直接機械接觸(in direct mechanical contact)。或者,具有適當的耐熱性(temperature-resistance)之額外層可以被插入該經圖案化的突出層與該塗佈層之間和/或該塗佈層與該坩堝的一壁之間。The coating layer can be deposited directly on one or more walls in the crucible. The patterned protruding layer can be directly deposited on the coating layer below it, that is, in direct mechanical contact with the coating layer. Alternatively, an additional layer with appropriate temperature-resistance may be inserted between the patterned protruding layer and the coating layer and / or between the coating layer and a wall of the crucible.

特定地,該經圖案化的突出層含有一基材,其可以是一相同於或一類似於其下方的該塗佈層之材料的耐熱材料。Specifically, the patterned protruding layer contains a substrate, which may be a heat-resistant material that is the same as or similar to the material of the coating layer below it.

特別地,該基材可包含或是由氮化矽所組成。類似地如同於該塗佈層,該基材的材料可作為一鑄塊脫模劑(releasing agent)。在此情況下,一“可與自熔融矽生長出鑄塊相容的耐熱材料”可以被理解為一受溫度影響時不會顯著地永久地改變其物理和/或化學特性之材料,儘管它們典型地發生在自一矽熔融物生長出鑄塊期間,亦即典型地超過1000℃或在多次情況下超過1500℃的溫度。特別地,該耐熱材料不可在前述的溫度下融化或燃燒。該經圖案化的突出層的基材可形成一層或膜。成核促進材料的細小顆粒可以被包括入此基材內。其中,該基材以及該等顆粒的特性被適用以使得該等顆粒局部地自該基材突出。換言之,例如一基材層被施加至該底壁的內表面之厚度可以是相同大小等級(order of magnitude)或可以是小於該等被嵌入該基材內之顆粒中的至少多數個的尺寸,以使得至少這些顆粒不會完全地被包覆在該基材中而朝向該容器的該內部自該基材突出。換言之,該等突出的顆粒形成自該底壁的內表面朝向該容器的內部延伸的細小或甚至是微細的突出(microscopic protrusions)。該等突出可形成一規則的(regular)或是一不規則的(irregular)(例如隨機的)圖案。In particular, the substrate may include or consist of silicon nitride. Similarly to the coating layer, the material of the substrate can be used as a releasing agent. In this context, a "heat-resistant material compatible with ingots grown from molten silicon" can be understood as a material that does not significantly and permanently change its physical and / or chemical properties when affected by temperature, although they This typically occurs during the growth of an ingot from a silicon melt, that is to say a temperature typically exceeding 1000 ° C or in many cases exceeding 1500 ° C. In particular, the heat-resistant material cannot be melted or burned at the aforementioned temperature. The substrate of the patterned protruding layer may form a layer or a film. Fine particles of a nucleation promoting material may be included in the substrate. Among them, the characteristics of the substrate and the particles are adapted so that the particles locally protrude from the substrate. In other words, for example, the thickness of an inner surface of a substrate layer applied to the bottom wall may be the same order of magnitude or may be smaller than at least a majority of the particles embedded in the substrate. So that at least the particles are not completely coated in the substrate and protrude from the substrate toward the interior of the container. In other words, the protruding particles form fine or even microscopic protrusions extending from the inner surface of the bottom wall toward the inside of the container. The highlights can form a regular or an irregular (eg random) pattern.

這些突出的顆粒是由一成核促進材料所製成。此意為:該等顆粒大致上是以一不同於該基材之材料並且具有其他物理特性的材料所製成。因此,由於該等不同的物理特性,該等突出的顆粒中的每一個可以在固化該坩堝內的該矽熔融物時作為成核點(nucleation point)。換言之,在該坩堝內的該矽熔融物冷卻時,固化過程將會較佳地起始於該等成核點中的一個。These protruding particles are made of a nucleation promoting material. This means that the particles are generally made of a material that is different from the material of the substrate and has other physical properties. Therefore, due to the different physical characteristics, each of the protruding particles can serve as a nucleation point when the silicon melt in the crucible is solidified. In other words, when the silicon melt in the crucible is cooled, the solidification process will preferably start at one of the nucleation points.

已被觀察到的是,在固化一矽熔融物時提供大量的成核點可在所形成的矽鑄塊中產生細小的晶粒(crystal grains)。該等細小晶粒於該鑄塊中的存在可因而減少一朝向該鑄塊的頂端之差排密度缺陷擴張(dislocation density defects propagation)。因此,自該鑄塊切成之晶圓的物理特性可被增強並且利用該鑄塊所產製的一太陽能電池的轉換效率(conversion efficiency)可被改善。It has been observed that providing a large number of nucleation points when solidifying a silicon melt can generate fine crystal grains in the formed silicon ingot. The presence of the fine grains in the ingot can thus reduce a dislocation density defect propagation towards the top of the ingot. Therefore, the physical characteristics of the wafer cut from the ingot can be enhanced and the conversion efficiency of a solar cell produced using the ingot can be improved.

依據一具體例,該經圖案化的突出層是僅被施加至該底壁的該內表面。According to a specific example, the patterned protruding layer is applied only to the inner surface of the bottom wall.

換言之,儘管該經圖案化的突出層是被施加至該底壁的該內表面,其較佳地是不被施加至該容器的該側壁的內表面。In other words, although the patterned protruding layer is applied to the inner surface of the bottom wall, it is preferably not applied to the inner surface of the side wall of the container.

在一方面,被觀察到的是:為了獲得針對所預期之經減少的差排密度缺陷擴張所提供的多數成核點的有益效果,僅將該經圖案化的突出層施加至該底壁即可能是足夠的。亦將該經圖案化的突出層施加至該容器的該側壁顯示出並未進一步改善在此坩堝內所生長出的一鑄塊的物理特性。在另一方面,其顯示出:僅將該經圖案化的突出層施加至該底壁的該內表面但不施加至該側壁的該內表面可改善該坩堝在生長一矽鑄塊期間的特性。舉例來說,僅被該塗佈層所覆蓋但不被一經圖案化的突出層所覆蓋的側壁的非-濕潤之內表面可簡化一所生長出的鑄塊於固化後的一脫模過程。On the one hand, it has been observed that, in order to obtain the beneficial effect of the majority of nucleation points provided by the expected reduction of the difference in density of the differential row density, the patterned protruding layer is applied to the bottom wall only May be enough. The application of the patterned protruding layer to the side wall of the container also showed that the physical characteristics of an ingot grown in the crucible were not further improved. In another aspect, it was shown that applying the patterned protruding layer to the inner surface of the bottom wall but not to the inner surface of the side wall can improve the characteristics of the crucible during the growth of a silicon ingot . For example, the non-wet inner surface of the sidewall that is only covered by the coating layer but not covered by the patterned protruding layer may simplify a demolding process of a growing ingot after curing.

依據一具體例,該成核促進材料是被適用供用於在與一液態矽熔融物接觸時形成一濕潤劑。According to a specific example, the nucleation-promoting material is suitable for forming a wetting agent when in contact with a liquid silicon melt.

換言之,被用於被包含在該經圖案化的突出層中的該等顆粒之材料應較佳地被選擇,而使得一與位於該坩堝的底部的該等突出顆粒接觸的液態矽熔融物可至少於這些顆粒突出於該基材外的表面將其潤濕(wet)。由於此潤濕特性,該等顆粒可作為成核點從而改變覆蓋該容器的該底壁的內表面之層的表面型態。In other words, the material used for the particles contained in the patterned protruding layer should preferably be selected so that a liquid silicon melt in contact with the protruding particles located at the bottom of the crucible can be used. At least the particles protrude beyond the surface of the substrate to wet it. Due to this wetting characteristic, the particles can serve as nucleation points to change the surface configuration of the layer covering the inner surface of the bottom wall of the container.

依據一具體例,該等成核促進材料之顆粒是矽砂(Silica sand, SiO2 )、碳化矽(SiC)或碳(Carbon, C)顆粒。矽砂(SiO2 )可以是較佳的選擇。According to a specific example, the particles of the nucleation-promoting material are silica sand (SiO 2 ), silicon carbide (SiC), or carbon (Carbon, C) particles. Silica sand (SiO 2 ) may be a better choice.

換言之,該等顆粒可以是由氧化矽(Silicon oxide)或碳化矽或碳所組成並且可具有像是砂粒(grains of sand)的典型尺寸與形狀。舉例來說,該等顆粒可具有尖銳的尖端,銳利的邊緣或類似者。或者,該等顆粒可以是圓形或甚至是似球狀(sphere-like)。此砂顆粒已被觀察到當其局部地自一實質地由氮化矽所組成之基材突出並與欲固化之經融化的矽接觸時可作為成核點。In other words, the particles may be composed of silicon oxide or silicon carbide or carbon and may have a typical size and shape like grains of sand. For example, the particles may have sharp points, sharp edges, or the like. Alternatively, the particles may be round or even sphere-like. This sand particle has been observed to act as a nucleation point when it partially protrudes from a substrate consisting essentially of silicon nitride and contacts the molten silicon to be solidified.

舉例來說,該等成核促進材料之顆粒可具有介於20 μm與2 mm間的尺寸,較佳地是介於100 μm與1 mm間。For example, the particles of the nucleation promoting material may have a size between 20 μm and 2 mm, preferably between 100 μm and 1 mm.

該等顆粒的尺寸已被觀察到會產生一有益的經圖案化的突出層,尤其是當該等顆粒可自一圍繞的基材稍微地突出達例如幾微米至幾百微米,但不致延伸過長而進入該容器的內部,否則其可能干擾一矽鑄塊的生長或甚至損害該生長鑄塊的一表面層(superficial layer)。The size of the particles has been observed to produce a beneficial patterned protruding layer, especially when the particles can protrude slightly from a surrounding substrate, for example, to several micrometers to several hundred micrometers, but do not extend beyond Grow into the interior of the container, otherwise it may interfere with the growth of a silicon ingot or even damage a superficial layer of the growth ingot.

應被理解的是:該等被包含在該經圖案化的突出層內的顆粒可藉由一顆粒尺寸分布(particle size distribution)而被提供。此意為:大致上非所有顆粒皆具有相同的尺寸但顆粒尺寸可變動。較佳地,該顆粒尺寸分布使得至少50%,較佳地至少90%的所有被包含在該經圖案化的突出層的顆粒分別具有一範圍落在20 μm至2 mm或介於100 μm與1 mm間的尺寸。It should be understood that the particles contained in the patterned protruding layer may be provided by a particle size distribution. This means that substantially not all particles have the same size but the particle size can vary. Preferably, the particle size distribution is such that at least 50%, preferably at least 90% of all particles contained in the patterned protruding layer have a range falling between 20 μm to 2 mm or between 100 μm and Dimensions between 1 mm.

依據一具體例,該經圖案化的突出層具有一介於0.3 mm與3 mm間,較佳地是介於1 mm與2 mm間的厚度。According to a specific example, the patterned protruding layer has a thickness between 0.3 mm and 3 mm, preferably between 1 mm and 2 mm.

提供具有此厚度的經圖案化的突出層已經被觀察到會產生在此坩堝中所生長出的鑄塊之有益的物理特性。Providing a patterned protrusion layer with this thickness has been observed to produce beneficial physical properties of ingots grown in this crucible.

可被注意的是:該經圖案化的突出層可不具有一均勻的厚度(uniform thickness)。舉例來說,該經圖案化的突出層在其中只有該基材形成該經圖案化的突出層之區域內可具有一較低的厚度,然而它在其中顆粒自該基材突出之區域內可具有一延伸的厚度。因此,術語“該經圖案化的突出層的厚度”在此處可以被理解為意指該經圖案化的突出層的一平均厚度。此外,由於該經圖案化的突出層的厚度主要地由該基材被施加在該底壁的該內表面之上所使用的厚度所決定,該經圖案化的突出層的厚度粗略地對應於此基材的厚度,並且可超過該基材層的厚度達到例如不超過30%,較佳地是不超過10%。換言之,該等局部地自該基材突出的顆粒可增加該經圖案化的突出層的平均厚度達到僅約該基材層厚度的30%,較佳地是僅約10%。It may be noted that the patterned protruding layer may not have a uniform thickness. For example, the patterned protruding layer may have a lower thickness in a region where only the substrate forms the patterned protruding layer, but it may have a lower thickness in a region where particles protrude from the substrate. Has an extended thickness. Therefore, the term "thickness of the patterned protruding layer" can be understood herein to mean an average thickness of the patterned protruding layer. In addition, since the thickness of the patterned protruding layer is mainly determined by the thickness used by the substrate to be applied over the inner surface of the bottom wall, the thickness of the patterned protruding layer roughly corresponds to The thickness of the substrate may exceed the thickness of the substrate layer by, for example, not more than 30%, preferably not more than 10%. In other words, the particles that partially protrude from the substrate can increase the average thickness of the patterned protruding layer to only about 30% of the thickness of the substrate layer, preferably only about 10%.

特別地,在一方面,選擇被包含在該經圖案化的突出層中的顆粒的一有益的尺寸分布,並且在另一方面,選擇該經圖案化的突出層的一有益的厚度,可影響在該經圖案化的突出層中的一顆粒分布和/或該等顆粒自該經圖案化的突出層之該基材突出的一距離。In particular, on the one hand, selecting a beneficial size distribution of particles contained in the patterned protruding layer, and on the other hand, selecting a beneficial thickness of the patterned protruding layer can affect A particle distribution in the patterned protruding layer and / or a distance that the particles protrude from the substrate of the patterned protruding layer.

舉例來說,具有大顆粒被嵌入在一極薄的經圖案化的突出層大致上會導致僅有少數個顆粒突伸進入該容器的內部,但這些顆粒是相對地大並且因而突伸得相當遠而進入此內部。此極端的構型對於所形成的生長出的矽鑄塊的物理特性而言不是最佳條件。For example, having large particles embedded in a very thin patterned protruding layer would generally cause only a few particles to protrude into the interior of the container, but the particles are relatively large and thus protrude quite well Far into this interior. This extreme configuration is not optimal for the physical characteristics of the resulting grown silicon ingot.

在另一個極端中,極小顆粒被包含在一厚的經圖案化的突出層內可能導致這些顆粒中的多數者完全地被包覆在該基材內而非自其突出。因此,僅有少數個顆粒可作為成核點。In the other extreme, the inclusion of very small particles in a thick patterned protruding layer may cause most of these particles to be completely encapsulated within the substrate rather than protrude from it. Therefore, only a few particles can be used as nucleation sites.

因此,在一方面,該等被嵌入在該基材中的顆粒的尺寸分布,以及在另一方面,該經圖案化的突出層的厚度應該互為相關地被恰當地適用。Therefore, on the one hand, the size distribution of the particles embedded in the substrate, and on the other hand, the thickness of the patterned protruding layer should be appropriately applicable in relation to each other.

特定地,依據一具體例,被包含在該經圖案化的突出層中的顆粒的一數量、這些顆粒的一尺寸分布和/或該經圖案化的突出層的一厚度可以特定地被選擇而使得該等自該基材突出的成核促進材料的顆粒是以一介於1 /cm2 至10 /cm2 間的表面密度(areal density)被包含在該經圖案化的突出層中,較佳地是介於7 /cm2 至10 /cm2 間。Specifically, according to a specific example, a number of particles contained in the patterned protruding layer, a size distribution of the particles, and / or a thickness of the patterned protruding layer may be specifically selected. The particles of the nucleation promoting material protruding from the substrate are preferably contained in the patterned protruding layer with an area density between 1 / cm 2 and 10 / cm 2 . The ground is between 7 / cm 2 and 10 / cm 2 .

提供具有此表面密度的該經圖案化的突出層中的該等顆粒已經被觀察到會產生在此坩堝所生長出的矽鑄塊的有益的物理特性。特別地,突出顆粒的該表面密度可影響在固化該鑄塊期間的一成核點密度,並且因此可以一有益的方式影響在所形成的鑄塊中的一差排缺陷密度。舉例來說,多數個成核點可增加晶粒(grains)的數量並繼而可產生更隨機的每單位體積的晶粒介面(grain boundaries per unit volume)。每單位體積的晶粒介面面積(grain boundary area per unit volume)越高,差排插在晶粒介面的機率大致上就會越高,因為介於兩個相鄰的晶粒間的錯位(misalignment)由於能量障礙(energy barrier)而無法輕易地容許差排越過介面。更高集中度的差排可以被容納在一單位體積的材料中。因此,更多的晶粒介面將大致上減緩一差排擴張。The particles in the patterned protruding layer providing this surface density have been observed to produce beneficial physical properties of silicon ingots grown in this crucible. In particular, the surface density of the protruding particles can affect a nucleation point density during curing of the ingot, and thus can affect a poor row defect density in the formed ingot in a beneficial manner. For example, a large number of nucleation points can increase the number of grains and in turn can generate more random grain boundaries per unit volume. The higher the grain boundary area per unit volume, the higher the probability of differential row insertion at the grain interface, because of misalignment between two adjacent grains. Due to energy barriers, it is not easy to tolerate the difference across the interface. Higher concentration differentials can be contained in a unit volume of material. As a result, more die interfaces will substantially slow a differential expansion.

矽砂或碳化矽或碳顆粒尺寸分布應必要地受控制,俾以製造一不具有任何沉積(sedimentation)的穩定漿料(slurry),以及避免更高的在晶圓級(wafer level)的間隙氧含量(interstitial oxygen content)。較小的顆粒可造成較高的表面積並且在鑄塊製程期間可釋出更多氧氣進入該熔融物內。其中大部分是典型地如SiO氣體自融化的表面散失,但一剩餘部分可能會滯留在該熔融物內並且可能會溶入矽晶體(crystalline silicon)內。因此,控制顆粒尺寸和/或顆粒尺寸分布可能是有益的。The size distribution of silica sand or silicon carbide or carbon particles should be controlled as necessary to produce a stable slurry without any sedimentation and to avoid higher wafer level gaps Oxygen content (interstitial oxygen content). Smaller particles can result in higher surface area and more oxygen can be released into the melt during the ingot process. Most of these are typically lost from surfaces such as SiO gas self-melting, but a remaining portion may remain in the melt and may dissolve into crystalline silicon. Therefore, it may be beneficial to control particle size and / or particle size distribution.

依據一具體例,該塗佈層具有一介於0.1 mm與1 mm間的厚度,較佳地是介於0.4 mm與0.5 mm間。According to a specific example, the coating layer has a thickness between 0.1 mm and 1 mm, preferably between 0.4 mm and 0.5 mm.

一具有此厚度的塗佈層在一方面可輕易地被施加至該容器的內表面,同時在另一方面,可提供足夠的保護和/或脫模特性。A coating layer having such a thickness can be easily applied to the inner surface of the container on the one hand, and at the same time, can provide sufficient protection and / or release characteristics.

依據一具體例,該塗佈層是使用一特定的漿料(在此處被稱為“第一漿料”)而被施加,其包含至少氮化矽粉末。此外,在一較佳的具體例中,該第一漿料還包含一黏合劑(binding agent)、一分散劑(dispersing agent)以及去離子水(deionised water)。較佳地,該第一漿料不含有任何進一步的成分或試劑(agents)。According to a specific example, the coating layer is applied using a specific slurry (referred to herein as a “first slurry”), which includes at least a silicon nitride powder. In addition, in a preferred embodiment, the first slurry further includes a binding agent, a dispersing agent, and deionised water. Preferably, the first slurry does not contain any further ingredients or agents.

依據另一個具體例,該經圖案化的突出層是使用一含有至少氮化矽粉末以及成核促進材料的顆粒的第二漿料而被施加。此外,依據一較佳的具體例,該第二漿料還包含一黏合劑、一分散劑以及去離子水。再一次,較佳地,該第二漿料不含有任何進一步的成分或試劑。According to another specific example, the patterned protruding layer is applied using a second slurry containing at least silicon nitride powder and particles of a nucleation promoting material. In addition, according to a preferred embodiment, the second slurry further includes a binder, a dispersant, and deionized water. Again, preferably, the second slurry does not contain any further ingredients or reagents.

此等第一和/或第二漿料可輕易地被添加至該容器的壁的內表面。此外,此等漿料可透過少量施力和/或以低成本而被施加。舉例來說,該等漿料可以被噴灑(sprayed)在該等內表面上。舉例來說,一特別的分注噴灑系統(dispensing spray system)可以被應用於噴灑該等漿料至欲分別被一塗佈層和/或一經圖案化的突出層所覆蓋的表面上。該等內表面的塗佈可以在經提高的溫度下被完成。或者其他施加該第一和/或第二漿料的技術可以被使用。舉例來說,一經圖案化的遮罩(patterned mask)[如同其是普遍地被使用在例如網版印刷(screen printing)]可以被應用。These first and / or second slurries can be easily added to the inner surface of the wall of the container. In addition, these slurries can be applied with a small amount of force and / or at a low cost. For example, the slurries may be sprayed on the inner surfaces. For example, a special dispensing spray system may be applied to spray the slurry onto surfaces to be covered by a coating layer and / or a patterned protruding layer, respectively. The coating of such internal surfaces can be completed at elevated temperatures. Or other techniques of applying the first and / or second slurry can be used. For example, a patterned mask [as it is commonly used in, for example, screen printing] can be applied.

該被包含在該等漿料中的氮化細粉末可以是一小的氮化矽顆粒,其具有範圍落在0.1 μm至5 μm間之典型的尺寸。該氮化矽粉末可具有一較佳地超過98%,更較佳地是超過99.9%的純度(purity)。The nitrided fine powder contained in the slurry may be a small silicon nitride particle having a typical size ranging from 0.1 μm to 5 μm. The silicon nitride powder may have a purity of more than 98%, more preferably more than 99.9%.

該黏合劑可包含聚乙烯醇(polyvinyl alcohol)或膠態氧化矽(colloidal silica)。較佳地,該黏合劑可包含膠態氧化矽以及具有一為5-100奈米之顆粒尺寸之大約50%重量的固態氧化矽(solid silica)。The adhesive may include polyvinyl alcohol or colloidal silica. Preferably, the adhesive may include colloidal silica and about 50% by weight solid silica having a particle size of 5-100 nanometers.

該分散劑可包含丙二醇(propylene glycol)。The dispersant may include propylene glycol.

應當被注意的是:指出“一層是使用一特定的漿料而被施加”的表述可以被解讀在一方面如同定義一用於形成該各別層的生產過程之特定的特性,或者,在另一方面,可以是定義由該特定生產方法所形成的該各別層之結構的特徵。以更明確的語句來表達,一使用一第一漿料而被施加的塗佈層或一使用一第二漿料而被施加的經圖案化的突出層將大致上具有這些層是使用一漿料而被施加之事實所產生的物理和/或結構性質,藉以異於使用其他技術{諸如CVD [化學蒸氣沉積(Chemical Vapour Deposition)]或PVD [物理蒸氣沉積(Physical Vapour Deposition)]}而被施加的層。舉例來說,使用特定的漿料而被施加的一塗佈層或一經圖案化的突出層具有該漿料包含或多或少的肉眼可見的粉末顆粒(macroscopic powder particles)之事實所產生的一特定的粒狀結構(granular structure),然而例如使用CVD或PVD而被施加的一層是典型地更均勻(homogeneous),其是由它是以更小的微細顆粒(microscopic particles)[諸如原子、分子和/或它們的團簇(clusters)]所組合(built-up)而成之事實所產生。此外,儘管某些在其加工期間被包含在該漿料內的成分(諸如該黏合劑、該分散劑和/或該去離子水)可能在該漿料之後續的加工期間已經消失並且可能因而不存在於最終的該塗佈層和/或經圖案化的突出層內,這些成分或試劑是該第一和/或該第二漿料的部分之事實仍典型地產生所形成的層之特定的物理和/或結構特性。舉例來說,所形成的該等層可具有一典型的多孔性(porosity)或形態(morphology),其是異於使用其他技術(諸如CDV或PVD)而被施加的層,特別是氮化矽層。It should be noted that the statement that "a layer is applied using a specific slurry" can be interpreted on one hand as defining a specific characteristic of the production process used to form the respective layer, or on another On the one hand, it may be a feature that defines the structure of the individual layers formed by the particular production method. To put it more clearly, a coating layer applied using a first paste or a patterned protruding layer applied using a second paste will have roughly these layers using a paste The physical and / or structural properties resulting from the fact that materials are applied are different from using other techniques {such as CVD [Chemical Vapour Deposition] or PVD [Physical Vapour Deposition]] Applied layer. For example, a coating layer or a patterned protruding layer that is applied using a specific slurry has a result of the fact that the slurry contains more or less macroscopic powder particles. A specific granular structure, however, a layer that is applied, for example, using CVD or PVD is typically more homogeneous, because it is based on smaller microscopic particles [such as atoms, molecules And / or their clusters] are built-up. In addition, although certain ingredients (such as the binder, the dispersant, and / or the deionized water) contained in the slurry during its processing may have disappeared during subsequent processing of the slurry and may thus Not present in the final coating layer and / or patterned protruding layer, the fact that these ingredients or reagents are part of the first and / or the second paste still typically results in the specificity of the layer formed Physical and / or structural characteristics. For example, the layers formed may have a typical porosity or morphology, which is a layer different from that applied using other technologies such as CDV or PVD, especially silicon nitride Floor.

依據一如本發明的第二個方面所定義之該方法的一具體例,相較於被使用來沉積該經圖案化的突出層的該第二漿料,用於施加該塗佈層的該第一漿料具有一較低的黏度(viscosity)。According to a specific example of the method as defined in the second aspect of the present invention, compared to the second paste used to deposit the patterned protruding layer, the method for applying the coating layer is The first slurry has a lower viscosity.

舉例來說,該第一漿料可具有一低於100 cP,較佳地是低於10 cP之黏度,反之該第二漿料可具有一超過100 cP,較佳地是超過500 cP的黏度。由於其低黏度,該第一漿料可輕易地以一均勻的厚度而被施加。該具有較高黏度的第二漿料可以被噴灑或澆鑄並接著可選擇地被分散在該容器的該底壁的內表面上。For example, the first slurry may have a viscosity of less than 100 cP, preferably less than 10 cP, while the second slurry may have a viscosity of more than 100 cP, preferably more than 500 cP. . Due to its low viscosity, the first slurry can be easily applied with a uniform thickness. The higher viscosity second slurry may be sprayed or cast and then optionally dispersed on the inner surface of the bottom wall of the container.

經圖案化的多數個突出點(protrusion spots)或一層可例如透過一遮罩的輔助而被施加,像是網版印刷,或透過一特別的分注噴灑系統。因此,一表面可具有一丘陵(hill)(濕潤)與山谷(valley)(非-濕潤)的表面結構。The patterned plurality of protrusion spots or layers can be applied, for example, with the aid of a mask, such as screen printing, or through a special dispensing spray system. Therefore, a surface may have a surface structure of hills (wet) and valleys (non-wet).

依據一具體例,相較於該第二漿料,該第一漿料具有一較低的密度。According to a specific example, the first slurry has a lower density than the second slurry.

舉例來說,該第一漿料可具有一低於1.6 g/cm3 ,較佳地是低於1.4 g/cm3 的密度,反之該第二漿料可具有一大於1.6 g/cm3 ,較佳地是大於1.9 g/cm3 的密度。For example, the first slurry may have a density of less than 1.6 g / cm 3 , preferably less than 1.4 g / cm 3 , and the second slurry may have a density of more than 1.6 g / cm 3 , A density greater than 1.9 g / cm 3 is preferred.

該第一漿料可利用較低的固含量(solid content)而被製成,以避免例如在自動噴灑製程(automatic spray process)中的淤塞(clogging)或封阻(blockage)問題。該第二漿料可利用較高的固含量而被製成,例如俾以製造一不具有任何沉積的穩定的漿料且能印刷出突出點。The first slurry can be made with a lower solid content to avoid problems such as clogging or blocking in an automatic spray process. The second paste can be made with a higher solids content, for example, to produce a stable paste without any deposits and capable of printing out protruding points.

應當被注意的是:本發明的具體例之可能的特徵和/或益處在此處是部分地相關於一坩堝並且部份地相關於一用於製備一坩堝的方法而被描述。一熟習本技藝者將會理解:依據本發明,針對該坩堝的具體例而被描述的特徵可以類似地被應用在該方法的一具體例中,且反之亦然。此外,一熟習本技藝者將會理解:不同的具體例的特徵可以被合併以或被替換以其他具體例的特徵和/或被修飾俾以達到本發明更多的具體例。It should be noted that the possible features and / or benefits of the specific examples of the present invention are described herein in part in relation to a crucible and in part in relation to a method for preparing a crucible. Those skilled in the art will understand that according to the present invention, the features described for the specific example of the crucible can be similarly applied to a specific example of the method, and vice versa. In addition, those skilled in the art will understand that the characteristics of different specific examples may be combined or replaced with the characteristics of other specific examples and / or modified to achieve more specific examples of the present invention.

較佳具體例之詳細說明Detailed description of preferred specific examples

圖1顯示依據本發明之一具體例之一坩堝1的剖面。該坩堝1呈一方型,亦即具有一盒形或立方形。對於該坩堝而言其他幾何形狀是可能的。FIG. 1 shows a cross section of a crucible 1 according to a specific example of the present invention. The crucible 1 has a square shape, that is, it has a box shape or a cubic shape. Other geometries are possible for the crucible.

該坩堝1包含一似鍋狀的(pot-like)容器3,其具有一底壁5以及側壁7。該底壁5大致上呈矩形且水平,而該側壁7為矩形且實質上直立(substantially vertical)。該底壁5以及該側壁7可形成一形成整個該容器3之整體組件。或者,該底壁5以及該側壁7可以是分離的組件,且可被安裝在一起俾以形成整個該容器3。該等壁5、7可利用似片狀(sheet-like)的組件所形成。舉例來說,該等壁5、7可利用熔融矽片(fused silica sheet)而被製成。典型地,該底壁5是數十公分長與數十公分寬。該側壁7是典型地數十公分高與數十公分寬。該底壁5以及該側壁7典型地具有一範圍落在幾毫米至幾公分內的厚度,例如介於3 mm以及10 cm間。The crucible 1 includes a pot-like container 3 having a bottom wall 5 and a side wall 7. The bottom wall 5 is substantially rectangular and horizontal, and the side wall 7 is rectangular and substantially vertical. The bottom wall 5 and the side wall 7 can form an integral component forming the entire container 3. Alternatively, the bottom wall 5 and the side wall 7 may be separate components and may be installed together to form the entire container 3. The walls 5, 7 can be formed using sheet-like components. For example, the walls 5, 7 can be made using a fused silica sheet. Typically, the bottom wall 5 is tens of centimeters long and tens of centimeters wide. The side wall 7 is typically tens of centimeters high and tens of centimeters wide. The bottom wall 5 and the side wall 7 typically have a thickness ranging from several millimeters to several centimeters, such as between 3 mm and 10 cm.

該底壁5以及該側壁7圍繞該容器3的一內部9。其中,該容器3較佳地於其頂端開放。The bottom wall 5 and the side wall 7 surround an interior 9 of the container 3. Among them, the container 3 is preferably opened at the top.

該底壁5以及該側壁7的內表面被塗佈一薄塗佈層(coating layer)11。該塗佈層11包含或是由供作為一耐熱材料(temperature-resistant material)的氮化矽(silicon nitride)所組成。該塗佈層11因而可耐受一被澆鑄至該容器3的矽熔融物(silicon melt)之極高的溫度。較佳地,該塗佈層11具有一400 μm至500 μm的厚度。較佳地,該塗佈層11為實質上均勻(substantially homogeneous),亦即不含有除了被用來形成該塗佈層11的該氮化矽粉末顆粒以外的肉眼可見的顆粒。特別地,該塗佈層11可具有一肉眼可見地均勻的厚度,且可具有一肉眼可見地光滑的,較佳地是平坦的表面。覆蓋該容器3的該側壁7之該塗佈層11的部分較佳地是不被任何其他層所覆蓋,亦即朝向該容器3的該內部9而顯露。A thin coating layer 11 is applied to the inner surfaces of the bottom wall 5 and the side wall 7. The coating layer 11 includes or consists of silicon nitride as a temperature-resistant material. The coating layer 11 can therefore withstand a very high temperature of the silicon melt cast into the container 3. Preferably, the coating layer 11 has a thickness of 400 μm to 500 μm. Preferably, the coating layer 11 is substantially homogeneous, that is, it does not contain particles visible to the naked eye other than the silicon nitride powder particles used to form the coating layer 11. In particular, the coating layer 11 may have a thickness uniformly visible to the naked eye, and may have a smooth, preferably flat surface that is visible to the naked eye. The part of the coating layer 11 covering the side wall 7 of the container 3 is preferably not covered by any other layer, that is, it is exposed towards the interior 9 of the container 3.

在該底壁5上,一附加層被施加在該塗佈層11之上。此附加層是一經圖案化的突出層(patterned protrusion layer)13,其較佳地覆蓋該底壁5的整個內表面。因此,在該底壁5上,該塗佈層11並未顯露,而是由疊加的該經圖案化的突出層13所覆蓋。On the bottom wall 5, an additional layer is applied on the coating layer 11. This additional layer is a patterned protruding layer 13 which preferably covers the entire inner surface of the bottom wall 5. Therefore, on the bottom wall 5, the coating layer 11 is not exposed, but is covered by the patterned protruding layer 13 which is superimposed.

如圖1之放大視圖中可見,該經圖案化的突出層13含有一其中多數個顆粒17被嵌入的基材(matrix)15。其中,該基材15含有供作為一耐熱材料的氮化矽。該等顆粒17是由一成核促進材料(nucleation enhancing material)所組成,諸如氧化矽(silica)。該等顆粒17突出於該基材15之上部顯露的表面外。因此,該等突出的顆粒17形成一種朝向該容器3的該內部9突出之具有成核促進尖端(nucleation enhancing tips)的圖案。As can be seen in the enlarged view of FIG. 1, the patterned protruding layer 13 contains a matrix 15 in which a plurality of particles 17 are embedded. The substrate 15 contains silicon nitride as a heat-resistant material. The particles 17 are composed of a nucleation enhancing material, such as silica. The particles 17 protrude beyond the exposed surface of the upper portion of the substrate 15. Therefore, the protruding particles 17 form a pattern with nucleation enhancing tips protruding toward the interior 9 of the container 3.

該等氧化矽顆粒17可具有範圍落在100 μm至1 mm內之典型的尺寸。一圖案尺寸,亦即介於相鄰之突出顆粒17間的側向平均距離(lateral average distance),可落在1 mm至2 mm之典型的範圍內。該等顆粒17的一突出高度(protruding height)可落在1 mm至2 mm之範圍內。The silicon oxide particles 17 may have a typical size ranging from 100 μm to 1 mm. A pattern size, that is, a lateral average distance between adjacent protruding particles 17, may fall within a typical range of 1 mm to 2 mm. A protruding height of the particles 17 may fall within a range of 1 mm to 2 mm.

最後,一用於製備或建造一坩堝1之方法的步驟是以一例示性的具體例而被說明。Finally, the steps of a method for preparing or constructing a crucible 1 are described with an illustrative specific example.

為了製備或建造該坩堝1,首先,一具有一底壁5以及側壁7的容器3被提供。To prepare or build the crucible 1, first, a container 3 having a bottom wall 5 and a side wall 7 is provided.

接著,一第一氮化矽塗佈漿料可藉由混合高純度的氮化矽粉末、去離子水、黏合劑以及分散劑而被製備。該第一漿料可繼而例如被噴灑或以其他方法[諸如網版印刷]被沉積(deposited)於該方型熔融矽坩堝1之該底壁5和該側壁7的內表面上。其中,該第一漿料可被施加以一例如介於400 μm與500 μm間之預期的特定塗佈厚度。該塗佈是典型地在介於40℃與50℃間之經提高的塗佈溫度下被進行。Next, a first silicon nitride coating slurry can be prepared by mixing a high-purity silicon nitride powder, deionized water, a binder, and a dispersant. The first slurry may then be sprayed or otherwise deposited on the inner surface of the bottom wall 5 and the side wall 7 of the square fused silicon crucible 1, for example by spraying or other methods such as screen printing. The first paste can be applied with a desired specific coating thickness, for example, between 400 μm and 500 μm. The coating is typically performed at an elevated coating temperature between 40 ° C and 50 ° C.

在該塗佈層11已透過該方法被施加後,一第二漿料是以氮化矽粉末、去離子水、一黏合劑以及一濕潤劑(wetting agent)而被製備。其中,該濕潤劑可藉由一成核促進材料(諸如矽砂顆粒)所製成之顆粒17而被形成。較佳地,此第二漿料是僅被施加至該底壁5或先前被施加於其上之該塗佈層11的內表面上。After the coating layer 11 has been applied through this method, a second slurry is prepared with silicon nitride powder, deionized water, a binder, and a wetting agent. The wetting agent can be formed by particles 17 made of a nucleation promoting material such as silica sand particles. Preferably, the second slurry is applied only to the inner wall of the bottom wall 5 or the coating layer 11 previously applied thereto.

當該第一漿料具有一例如為1.37 g/cm3 之相對地低的密度以及一例如為2.96 cP之低黏度時,該第二漿料具有一例如為1.96 g/cm3 之較高的密度以及一約為700 cP之較高的黏度。When the first slurry has a relatively low density such as 1.37 g / cm 3 and a low viscosity such as 2.96 cP, the second slurry has a relatively high density such as 1.96 g / cm 3 Density and a high viscosity of about 700 cP.

在已施加該塗佈層11以及該經圖案化的突出層13至該容器3之該等壁5、7的內表面上後,將該經塗佈的坩堝1以高溫及開放大氣(open atmosphere)的條件予以烘烤。在該等條件下,該第一以及第二漿料被固化並分別形成一緻密的塗佈層11以及經圖案化的突出層13。After the coating layer 11 and the patterned protruding layer 13 have been applied to the inner surfaces of the walls 5 and 7 of the container 3, the coated crucible 1 is exposed to high temperature and open atmosphere (open atmosphere). ). Under these conditions, the first and second pastes are cured and form a uniform dense coating layer 11 and a patterned protruding layer 13, respectively.

利用該坩堝1所生長出的矽鑄塊可顯示出減少的差排密度缺陷。有鑒於此,利用自該鑄塊切成的矽晶圓所製成的太陽能電池可具有一經改善的轉換效率。The silicon ingots grown using this crucible 1 can show reduced differential density defects. In view of this, a solar cell made from a silicon wafer cut from the ingot can have improved conversion efficiency.

最後,應當被注意的是:術語諸如“包含 (comprising)”不排除其他元件或步驟,以及“一(a)”或“一(an)”不排除一複數。結合不同的具體例而被描述的元件亦可以被合併。Finally, it should be noted that terms such as "comprising" do not exclude other elements or steps, and "an (a)" or "an" does not exclude a plural. Elements described in connection with different specific examples may also be combined.

1‧‧‧坩堝1‧‧‧ Crucible

3‧‧‧容器3‧‧‧ container

5‧‧‧底壁5‧‧‧ bottom wall

7‧‧‧側壁7‧‧‧ sidewall

9‧‧‧內部9‧‧‧ Internal

11‧‧‧塗佈層11‧‧‧ Coating

13‧‧‧經圖案化的突出層13‧‧‧ patterned protruding layer

15‧‧‧基材15‧‧‧ substrate

17‧‧‧顆粒17‧‧‧ particles

於下面內容中,本發明之具體例將會在此相關於附加的圖式而被描述。然而,該圖式或說明皆不應被解讀為對於本發明的限制。In the following, specific examples of the present invention will be described herein in relation to additional drawings. However, neither the illustration nor the description should be interpreted as a limitation on the present invention.

圖1顯示依據本發明的一具體例之坩堝的一剖視圖。FIG. 1 shows a cross-sectional view of a crucible according to a specific example of the present invention.

該圖式僅是一概略的表示,非實際比例。The figure is only a rough representation, not actual scale.

Claims (15)

一種用於生長矽鑄塊的坩堝,該坩堝包含: 一容器,其具有一底壁以及圍繞該容器的一內部的側壁; 一塗佈層,其被施加至該底壁以及該側壁的內表面,該塗佈層含有一可與自熔融矽所生長出之鑄塊相容的耐熱材料; 一經圖案化的突出層,其被施加於該底壁的內表面,該經圖案化的突出層含有一由可與自熔融矽所生長出之鑄塊相容的耐熱材料所組成的基材,並且還含有成核促進材料的顆粒,該等顆粒局部地自該基材突出。A crucible for growing a silicon ingot, the crucible comprising: a container having a bottom wall and an inner side wall surrounding the container; a coating layer applied to the bottom wall and an inner surface of the side wall The coating layer contains a heat-resistant material that is compatible with ingots grown from molten silicon; a patterned protruding layer is applied to the inner surface of the bottom wall, and the patterned protruding layer contains A substrate composed of a heat-resistant material compatible with ingots grown from molten silicon, and further containing particles of a nucleation promoting material, the particles partially protruding from the substrate. 如請求項1之坩堝,其中該經圖案化的突出層獨有地被施加至該底壁的內表面。As in the crucible of claim 1, wherein the patterned protruding layer is uniquely applied to the inner surface of the bottom wall. 如請求項1至2中任一項所述之坩堝,其中該成核促進材料是適用於在與一液態矽熔融物接觸時形成一濕潤劑。The crucible according to any one of claims 1 to 2, wherein the nucleation promoting material is suitable for forming a wetting agent when in contact with a liquid silicon melt. 如請求項1至3中任一項所述之坩堝,其中該成核促進材料的顆粒是矽砂(SiO2 )顆粒、碳化矽(SiC)顆粒以及碳(C)顆粒之其中一者。The requested item 1 to 3 according to any one of the crucible, wherein the nucleation promoting material into granules is silica sand (SiO 2) particles, silicon carbide (SiC) particles and carbon (C) in which particles of a person. 如請求項1至4中任一項所述之坩堝,其中該成核促進材料的顆粒具有介於20 μm與2 mm間的尺寸,較佳地為介於100 μm與1 mm間。The crucible according to any one of claims 1 to 4, wherein the particles of the nucleation promoting material have a size between 20 μm and 2 mm, preferably between 100 μm and 1 mm. 如請求項1至5中任一項所述的坩堝,其中該經圖案化的突出層具有介於0.3 mm與3 mm間的厚度,較佳地為介於1 mm與2 mm間。The crucible according to any one of claims 1 to 5, wherein the patterned protruding layer has a thickness between 0.3 mm and 3 mm, preferably between 1 mm and 2 mm. 如請求項1至6中任一項所述的坩堝,其中自該基材突出的該成核促進材料的顆粒是以一介於1 cm-2 至10 cm-2 的表面密度被包含在該經圖案化的突出層中,較佳地為介於7 cm-2 至10 cm-2 間。The crucible according to any one of claims 1 to 6, wherein particles of the nucleation promoting material protruding from the substrate are contained in the warp at a surface density of 1 cm -2 to 10 cm -2 . In the patterned protruding layer, it is preferably between 7 cm -2 and 10 cm -2 . 如請求項1至7中任一項所述的坩堝,其中該塗佈層具有一介於0.1 mm與1 mm間的厚度,較佳地為介於0.4 mm與0.5 mm間。The crucible according to any one of claims 1 to 7, wherein the coating layer has a thickness between 0.1 mm and 1 mm, preferably between 0.4 mm and 0.5 mm. 如請求項1至8中任一項所述的坩堝,其中被包含在該塗佈層以及該經圖案化的突出層中的至少一者之耐熱材料是氮化矽。The crucible according to any one of claims 1 to 8, wherein the heat-resistant material contained in at least one of the coating layer and the patterned protruding layer is silicon nitride. 如請求項1至9中任一項所述的坩堝,其中該塗佈層是使用一含有氮化矽粉末的第一漿料而被施加,並且較佳地,該第一漿料還含有一黏合劑、一分散劑以及去離子水。The crucible according to any one of claims 1 to 9, wherein the coating layer is applied using a first slurry containing silicon nitride powder, and preferably, the first slurry further contains a A binder, a dispersant, and deionized water. 如請求項1至10中任一項所述的坩堝,其中該經圖案化的突出層是使用一含有氮化矽粉末以及該成核促進材料的顆粒的第二漿料而被施加,並且較佳地,該第二漿料還含有一黏合劑、一分散劑以及去離子水。The crucible according to any one of claims 1 to 10, wherein the patterned protruding layer is applied using a second slurry containing silicon nitride powder and particles of the nucleation promoting material, and is Preferably, the second slurry further contains a binder, a dispersant, and deionized water. 一種製備一用於生長矽鑄塊的坩堝的方法,該方法包含: 提供一容器,其具有一底壁以及圍繞該容器的一內部的側壁; 施加一塗佈層至該底壁以及該側壁的內表面,該塗佈層含有一可與自熔融矽所生長出之鑄塊相容的耐熱材料; 施加一經圖案化的突出層至該底壁的內表面上,該經圖案化的突出層含有一由可與自熔融矽所生長出之鑄塊相容的耐熱材料所組成的基材,並且還含有成核促進材料的顆粒, 其中該經圖案化的突出層是以此方式被施加,以及該等顆粒適用於使該等顆粒局部地自該基材突出。A method for preparing a crucible for growing a silicon ingot, the method comprising: providing a container having a bottom wall and an inner side wall surrounding the container; applying a coating layer to the bottom wall and the side wall The inner surface, the coating layer contains a heat-resistant material compatible with the ingot grown from the molten silicon; a patterned protruding layer is applied to the inner surface of the bottom wall, the patterned protruding layer contains A substrate composed of a heat-resistant material compatible with ingots grown from molten silicon, and further containing particles of a nucleation promoting material, wherein the patterned protruding layer is applied in this manner, and The particles are suitable for causing the particles to partially protrude from the substrate. 如請求項12所述的方法,其中該塗佈層是使用一含有氮化矽粉末的第一漿料而被施加,且該經圖案化的突出層是使用一含有氮化矽粉末以及該成核促進材料的顆粒的第二漿料而被施加。The method according to claim 12, wherein the coating layer is applied using a first slurry containing silicon nitride powder, and the patterned protruding layer is using a silicon nitride powder and the forming layer. A second slurry of particles of the core promoting material is applied. 如請求項12和13中任一項所述的方法,其中相較於該第二漿料,該第一漿料具有一較低的黏度。The method according to any one of claims 12 and 13, wherein the first slurry has a lower viscosity than the second slurry. 如請求項12至14中任一項所述的方法,其中相較於該第二漿料,該第一漿料具有一較低的密度。The method according to any one of claims 12 to 14, wherein the first slurry has a lower density than the second slurry.
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