TW201638601A - Method of adjusting displacement distance of probe in accordance with horizontal positions of multiple to-be-tested points - Google Patents

Method of adjusting displacement distance of probe in accordance with horizontal positions of multiple to-be-tested points Download PDF

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Publication number
TW201638601A
TW201638601A TW104113882A TW104113882A TW201638601A TW 201638601 A TW201638601 A TW 201638601A TW 104113882 A TW104113882 A TW 104113882A TW 104113882 A TW104113882 A TW 104113882A TW 201638601 A TW201638601 A TW 201638601A
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Taiwan
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probe
point
probes
driving device
calibration procedure
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TW104113882A
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Chinese (zh)
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TWI528041B (en
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Ke-Lun Wang
Zheng-Tai Chen
rui-ming Chen
Zhi-Wei Chen
meng-long Jiang
Bo-Han Zhou
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Hauman Technologies Corp
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Priority to TW104113882A priority Critical patent/TWI528041B/en
Priority to CN201610053850.7A priority patent/CN106093741B/en
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Publication of TW201638601A publication Critical patent/TW201638601A/en

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26Testing of individual semiconductor devices
    • G01R31/2601Apparatus or methods therefor

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)

Abstract

This invention relates to a method of adjusting a displacement distance of a probe in accordance with horizontal positions of multiple to-be-tested points. The method uses at least one point testing device to perform an equal pressure calibration process, which drives a driving device to move multiple probes so that the tips of the probes touch multiple to-be-tested points, respectively. This method further uses the point testing device to receive point-testing pressures applied onto the to-be-tested points by the probes. Then, it is determined that whether a difference among the point-testing pressures falls within a built-in threshold value. If so, the equal pressure calibration process is completed; if not, the driving device is then driven to further adjust the distances between the probe tips and the corresponding to-be-tested points. In this way, this method effectively prevents damages on the to-be-tested objects or influencing the point testing accuracy caused by oversize or undersize point-testing pressure.

Description

根據複數個待測點之水平位置調整探針之位移距離的方法 Method for adjusting displacement distance of probe according to horizontal position of a plurality of points to be measured

本發明係一種能根據待測物上之複數個待測點的水平位置,調整其對應之各個探針之針壓,以使各個待測點所承受之針壓位在預定之範圍內。 The invention is capable of adjusting the needle pressure of the corresponding probes according to the horizontal positions of the plurality of points to be tested on the object to be tested, so that the needle pressures received by the points to be measured are within a predetermined range.

查,現有發光二極體(Light-Emitting Diode,簡稱LED)係一種於通電後能產生光亮的半導體電子元件,其主要的發光元件為晶粒(crystal grain),由於晶粒的發光亮度、波長、色溫及操作電壓等特性會因製程條件上的些微差異而有所不同,因此,業者通常會透過一點測裝置執行「點測程序」,以能將電流準確地傳送至晶粒,並藉由量測該晶粒所發出的光線特性(如:波長、發光強度、顏色等),判斷出晶粒的製造品質,進而控管晶粒的出廠良率。 Inspect, the existing Light-Emitting Diode (LED) is a kind of semiconductor electronic component that can produce bright light after being energized. The main light-emitting component is crystal grain, due to the brightness and wavelength of the crystal grain. Characteristics such as color temperature and operating voltage may vary depending on slight differences in process conditions. Therefore, the manufacturer usually performs a "point test program" through a point measuring device to accurately transfer current to the die. The light characteristics (such as wavelength, luminous intensity, color, etc.) emitted by the crystal grains are measured, and the manufacturing quality of the crystal grains is judged, thereby controlling the factory yield of the crystal grains.

請參閱第1及2圖所示,係為申請人先前所設計之一點測裝置1的示意圖,該點測裝置1包括一承載台11及複數個針座12(在第1圖中僅繪示出一個針座12),其中,該承載台11之頂面能供放置至少一待測物(如:LED晶粒、積體電路...等),其底面則設有一第一驅動裝置13,該第一驅動裝置13能帶動該承載台11沿水平向或垂直向位移,在該實施例中,該第一驅動裝置13包括一第一縱向運動部131及一第一橫向運動部133,其中,該第一縱向運動部131能帶動該承載台11沿該點測裝置1之縱向位移,該第一橫向運動部133能帶動該承載台11沿該點測裝置1之橫向位移,如此,業者便能夠透過該第一驅動裝置13而控制該承載台11之位置。 Please refer to FIGS. 1 and 2 , which are schematic diagrams of a point measuring device 1 previously designed by the applicant. The measuring device 1 includes a carrying platform 11 and a plurality of needle holders 12 (only shown in FIG. 1 ) A needle holder 12) is provided, wherein the top surface of the loading table 11 can be used for placing at least one object to be tested (eg, LED die, integrated circuit, etc.), and a bottom surface is provided with a first driving device 13 The first driving device 13 can drive the loading table 11 to be displaced horizontally or vertically. In this embodiment, the first driving device 13 includes a first longitudinal moving portion 131 and a first lateral moving portion 133. The first longitudinal moving portion 131 can drive the longitudinal displacement of the loading platform 11 along the pointing device 1. The first lateral moving portion 133 can drive the lateral displacement of the loading platform 11 along the pointing device 1 . The operator can control the position of the carrier 11 through the first drive unit 13.

復請參閱第1及2圖所示,各該針座12係位在該承載台11之上方,其一端分別設有一探針121,其中,該探針121之一端係連接至針 座12之一端,其另一端(即,針尖)則朝該承載台11之頂面方向延伸,另,各該針座12分別與一第二驅動裝置14相連接,該第二驅動裝置14能帶動該針座12沿水平向或垂直向位移,在該實施例中,該第二驅動裝置14包括一第二縱向運動部141及一第二橫向運動部143,其中,該第二縱向運動部141能帶動該針座12沿該點測裝置1之縱向位移,該第二橫向運動部143能帶動該針座12沿該點測裝置1之橫向位移,如此,業者便能夠藉由該第二驅動裝置14而調整該針座12之位置。 Referring to Figures 1 and 2, each of the hubs 12 is positioned above the carrier 11, and a probe 121 is disposed at one end thereof, wherein one end of the probe 121 is connected to the needle One end of the seat 12, the other end (ie, the needle tip) extends toward the top surface of the loading table 11, and each of the needle holders 12 is respectively connected to a second driving device 14, and the second driving device 14 can The second driving device 14 includes a second longitudinal moving portion 141 and a second lateral moving portion 143. The second longitudinal moving portion 143 is disposed in the horizontal direction or the vertical direction. The 141 can drive the longitudinal displacement of the hub 12 along the pointing device 1. The second lateral moving portion 143 can drive the lateral displacement of the hub 12 along the pointing device 1, so that the operator can use the second The drive unit 14 adjusts the position of the hub 12.

一般言,LED晶粒之尺寸約為1000~150微米(μm),其上之待測點(pad)之尺寸大小通常為50~70微米(μm),因此,工作人員並無法利用肉眼的方式觀看各個待測點之水平位置,且工作人員亦無法手動地微調複數個探針121之針尖位置,故,工作人員通常會將LED晶粒的待測點視為同一個水平位置,而採用同一個點測壓力,因此,復請參閱第1及2圖所示,現有的「點測程序」中,當工作人員欲檢測LED晶粒的品質時,能夠使第一驅動裝置13及第二驅動裝置14分別作動,以使該承載台11及該等針座12分別位在一點測位置,同時,該等針座12之探針121的另一端(即,針尖)會保持在同一水平位置,嗣,該等第二驅動裝置14會同時帶動該等針座12朝該承載台11之方向位移,直至該等探針121的另一端同時觸碰到承載台11上的LED晶粒後,將電流傳送至LED晶粒,以量測該LED晶粒所發出的光線特性。惟,一般言,LED晶粒上的複數個待測點,彼此間之水平高度並不相同,因此,當該等探針121同時下移並抵壓至對應的待測點後,倘若該等探針121之點測壓力(即,探針121所施加至待測點的壓力)係適合位在水平位置較低的待測點,則勢必會造成位在水平位置較高的待測點,承受較大的點測壓力,如此,在長時間使用下,不僅會加速探針121的磨損率,且過大的點測壓力亦容易造成LED晶粒損壞;另,若該等探針121之點測壓力係適合位在水平位置較高的待測點,則會導致位在水平位置較低的待測點與探針121彼此間無法緊密貼合,進而影響到點測之精準度。 In general, the size of the LED die is about 1000 to 150 micrometers (μm), and the size of the pad to be measured is usually 50 to 70 micrometers (μm), so the worker cannot use the naked eye. The horizontal position of each point to be measured is viewed, and the staff cannot manually fine-tune the position of the tip of the plurality of probes 121. Therefore, the worker usually regards the point to be measured of the LED die as the same horizontal position, and uses the same One point is to measure the pressure. Therefore, as shown in Figures 1 and 2, in the existing "pointing program", when the worker wants to detect the quality of the LED die, the first driving device 13 and the second driving can be made. The device 14 is respectively actuated so that the carrier 11 and the needle holders 12 are respectively positioned at the one-point measurement position, and the other end of the probe 121 of the needle holders 12 (ie, the needle tip) is maintained at the same horizontal position. The second driving device 14 will simultaneously drive the needle holders 12 toward the loading table 11 until the other end of the probes 121 simultaneously touch the LED dies on the carrier 11. Current is delivered to the LED die to measure the light emitted by the LED die Sex. However, in general, the plurality of points to be measured on the LED die are not the same level between each other. Therefore, when the probes 121 are simultaneously moved down and pressed to the corresponding points to be tested, if such The spotting pressure of the probe 121 (ie, the pressure applied by the probe 121 to the point to be measured) is suitable for the point to be measured at a lower horizontal position, which is bound to result in a point to be measured that is higher in the horizontal position. Withstand a large point pressure, so that under long-term use, not only will the wear rate of the probe 121 be accelerated, but too large point pressure will easily cause damage to the LED die; otherwise, if the probes 121 point When the pressure is suitable for the point to be measured with a higher horizontal position, the point to be measured with the lower position in the horizontal position and the probe 121 cannot be closely adhered to each other, thereby affecting the accuracy of the point measurement.

綜上所述可知,現有的「點測程序」於執行上,係存有各個待測點之點測壓力過大或過小等問題,如此一來,不僅會降低業者的點測 良率,且會造成LED晶粒損壞之情事,因此,如何提供一種更為優異之「點測程序」的方法,且不需大幅度更改原有之點測裝置,即成為相關業者之重要課題。 In summary, the existing "point test program" has problems such as excessive or too small point pressure at each point to be measured, which will not only reduce the industry's spot test. The yield is good, and it will cause damage to the LED die. Therefore, how to provide a more excellent "point test program" method without major changes to the original spot test device becomes an important issue for the relevant industry. .

有鑑於現有的點測程序中,複數支探針分別施加至對應之待測點的點測壓力,會存有點測壓力過大或過小等問題,造成晶粒損壞或影響點測之精準度等問題,因此,發明人憑藉著多年來的實務經驗,經過多次研究與測試後,終於設計出本發明之一種根據複數個待測點之水平位置調整探針之位移距離的方法,期能提供業界一更為易用、精準的嶄新點測程序。 In view of the existing spot testing program, the plurality of probes are respectively applied to the corresponding point-measuring pressure of the point to be tested, and there may be problems such as excessive or too small pressure measurement, causing grain damage or affecting the accuracy of the point measurement. Therefore, the inventor has, after many years of research and testing, finally designed a method for adjusting the displacement distance of the probe according to the horizontal position of a plurality of points to be measured by virtue of years of practical experience. A new and easy to use, accurate new point test program.

本發明之一目的,係提供一種根據複數個待測點之水平位置調整探針之位移距離的方法,以使各該探針之針尖能與對應之各該待測點保持在不同之距離,令各該待測點能承受適合之點測壓力,該方法應用至一點測裝置上,該點測裝置包括一承載台、複數個針座、一控制單元、一第一驅動裝置、複數個第二驅動裝置及一壓力感測單元,其中,該承載台能被該第一驅動裝置帶動,而沿水平向或垂直向位移,其頂部平置有至少一待測物,該待測物上至少有複數個待測點,該等待測點不一定具有相同之水平位置,各該針座係設於該承載台上方,且能分別被一第二驅動裝置帶動,而沿垂直向或水平向位移,各該針座上分別設有一探針,該探針能隨著該承載台或針座之位移,而抵靠至對應之待測點,該控制單元能使該第一驅動裝置及該等第二驅動裝置分別驅動對應之該承載台與該等針座之位移位置,該方法係使該控制單元執行執行一等壓調校程序,以驅動該等第二驅動裝置或該第一驅動裝置,使該等探針之針尖分別觸壓對應之該等待測點,且分別接收該壓力感測單元所感測到之該探針施加至對應之該待測點之一點測壓力,嗣,該控制單元會計算且判斷該等點測壓力間之一差值是否位於內建之一門檻值範圍內,或是判斷各該點測壓力是否分別位於內建之一點測門檻值範圍內,若是,即完成該等壓調校程序;否則,驅動各該第二驅動裝置,以進一步調校各該探針之針尖與對應之各該待測點間之距離,直到該差值落在該門檻值之範圍內,或是各該點測壓力分別位於 該點測門檻值範圍內,始完成該等壓調校程序。 An object of the present invention is to provide a method for adjusting the displacement distance of a probe according to the horizontal position of a plurality of points to be measured, so that the tip of each probe can be kept at a different distance from the corresponding point to be measured. The method is applied to a point measuring device, and the method includes a loading platform, a plurality of needle holders, a control unit, a first driving device, and a plurality of a driving device and a pressure sensing unit, wherein the carrier can be driven by the first driving device to be displaced horizontally or vertically, and at least one object to be tested is placed on the top of the device, and the object to be tested is at least There are a plurality of points to be tested, and the waiting points do not necessarily have the same horizontal position. Each of the needle holders is disposed above the platform and can be respectively driven by a second driving device to be displaced vertically or horizontally. Each of the needle holders is respectively provided with a probe, and the probe can abut against the corresponding point to be tested according to the displacement of the carrier or the needle seat, and the control unit can enable the first driving device and the first driving device The second drive unit is driven separately The displacement position of the loading platform and the needle holders, the method is such that the control unit performs an equal pressure calibration procedure to drive the second driving devices or the first driving device to enable the probes The needle tip respectively touches the corresponding waiting point, and receives the probe pressure sensed by the pressure sensing unit to be applied to one of the corresponding points to be measured, and the control unit calculates and determines the Whether one of the differential pressures is within a threshold value of the built-in threshold, or whether each of the measured pressures is within a range of built-in thresholds, and if so, the pressure calibration is completed. a program; otherwise, driving each of the second driving devices to further adjust a distance between a tip of each probe and a corresponding one of the points to be measured until the difference falls within the threshold value, or each The test pressure is located separately Within the range of the threshold value, the equal pressure calibration procedure is completed.

本發明之另一目的,係該控制單元執行該等壓調校程序之前,尚會先執行一等高調校程序,其中,該等高調校程序係該控制單元會根據一攝像單元所擷取到之該等探針之針尖位置,或該等探針之針尖與對應之該等待測點間之距離,產生對應之一調校資料,再根據該調校資料驅動該等第二驅動裝置,以沿水平向或垂直向調校該等探針之針尖的相對位置,令該等探針之針尖高度能保持在同一高,或該等探針之針尖與對應之該等待測點間之距離能保持在同一距離,如此,業者即能使該等探針抵靠至對應之待測點時,不會產生過大的點測壓力,以避免待測物損壞。 Another object of the present invention is that before the control unit executes the equal pressure calibration procedure, a first calibration procedure is executed first, wherein the high calibration procedure is that the control unit is configured according to a camera unit. Taking the position of the tip of the probe, or the distance between the tip of the probe and the corresponding waiting point, generating a corresponding calibration data, and driving the second driving device according to the calibration data Adjusting the relative positions of the probe tips of the probes in a horizontal or vertical direction so that the tip heights of the probes can be kept at the same height, or between the tip of the probes and the corresponding waiting point The distance can be kept at the same distance, so that the manufacturer can make the probes abut against the corresponding point to be tested, and no excessive pressure is generated to avoid damage to the object to be tested.

為便 貴審查委員能對本發明目的、技術特徵及其功效,做更進一步之認識與瞭解,茲舉實施例配合圖式,詳細說明如下: For your convenience, the review committee can make a further understanding and understanding of the purpose, technical features and effects of the present invention. The embodiments are combined with the drawings, and the details are as follows:

〔習知〕 [study]

1‧‧‧點測裝置 1‧‧‧Measurement device

11‧‧‧承載台 11‧‧‧Loading station

12‧‧‧針座 12‧‧‧ needle seat

121‧‧‧探針 121‧‧‧Probe

13‧‧‧第一驅動裝置 13‧‧‧First drive

131‧‧‧第一縱向運動部 131‧‧‧First longitudinal movement

133‧‧‧第一橫向運動部 133‧‧‧First lateral movement

14‧‧‧第二驅動裝置 14‧‧‧Second drive

141‧‧‧第二縱向運動部 141‧‧‧Second longitudinal movement

143‧‧‧第二橫向運動部 143‧‧‧Second Lateral Movement

〔本發明〕 〔this invention〕

2‧‧‧點測裝置 2‧‧‧Measurement device

21‧‧‧承載台 21‧‧‧Loading station

22‧‧‧針座 22‧‧‧ needle seat

221‧‧‧探針 221‧‧‧ probe

23‧‧‧控制單元 23‧‧‧Control unit

24‧‧‧第一驅動裝置 24‧‧‧First drive

25‧‧‧第二驅動裝置 25‧‧‧Second drive

26‧‧‧攝像單元 26‧‧‧ camera unit

27‧‧‧壓力感測單元 27‧‧‧ Pressure sensing unit

3‧‧‧待測物 3‧‧‧Test object

31、31A、31B‧‧‧待測點 31, 31A, 31B‧‧‧ points to be tested

4A‧‧‧等高調校程序 4A‧‧‧etc.

4B‧‧‧等壓調校程序 4B‧‧‧Isostatic adjustment procedure

第1圖係習知點測裝置之示意圖;第2圖係習知點測裝置之局部示意圖;第3圖係本發明之點測裝置之示意圖;第4圖係待測物之示意圖;及第5圖係本發明之方法流程圖。 1 is a schematic view of a conventional spot measuring device; FIG. 2 is a partial schematic view of a conventional spot measuring device; FIG. 3 is a schematic view of the spot measuring device of the present invention; FIG. 4 is a schematic view of a test object; Figure 5 is a flow chart of the method of the present invention.

本發明係一種根據複數個待測點之水平位置調整探針之位移距離的方法,該方法應用至一點測裝置2上,在一實施例中,請參閱第3圖所示,該點測裝置2包括一承載台21、複數個針座22、一控制單元23、一第一驅動裝置24、複數個第二驅動裝置25、一攝像單元26及至少一壓力感測單元27,其中,該承載台21係與該第一驅動裝置24相連接,以能被該第一驅動裝置24帶動,在該實施例中,該第一驅動裝置24能夠使該承載台21沿水平向或垂直向位移,且能使該承載台21以自身軸為中心,進行軸向旋轉,惟,由於前述第一驅動裝置24的結構及帶動承載台21方式並非本發明之重點,且申請人亦早就申請相關專利,故不予贅述。 The present invention is a method for adjusting the displacement distance of a probe according to the horizontal position of a plurality of points to be measured, and the method is applied to the point measuring device 2. In an embodiment, please refer to FIG. 3, the measuring device 2 includes a carrying platform 21, a plurality of needle holders 22, a control unit 23, a first driving device 24, a plurality of second driving devices 25, an imaging unit 26 and at least one pressure sensing unit 27, wherein the bearing The stage 21 is coupled to the first drive unit 24 to be capable of being driven by the first drive unit 24. In this embodiment, the first drive unit 24 can displace the stage 21 in a horizontal or vertical direction. Moreover, the loading platform 21 can be axially rotated about its own axis. However, the structure of the first driving device 24 and the manner of driving the loading platform 21 are not the focus of the present invention, and the applicant has long applied for a related patent. Therefore, it will not be repeated.

請參閱第3及4圖所示,該承載台21之頂部平置有至少一 待測物3(如:晶粒),該待測物3上至少有複數個待測點31(如:晶粒上之電極接點),在該實施例中,待測物3設有兩個待測點31A、31B,且待測點31A的水平位置高於待測點31B,惟,在本發明之其它實施例中,該等待測點31能具有相同的水平位置,或者,該待測物3能夠具有三個以上的待測點31,且該等待測點31不一定具有相同之水平位置,合先陳明。 Referring to Figures 3 and 4, the top of the carrying platform 21 is at least one flat. The object to be tested 3 (eg, a crystal grain), the object to be tested 3 has at least a plurality of points 31 to be measured (eg, electrode contacts on the die). In this embodiment, the object to be tested 3 is provided with two The points to be measured 31A, 31B, and the horizontal position of the point to be measured 31A is higher than the point to be measured 31B. However, in other embodiments of the present invention, the waiting point 31 can have the same horizontal position, or The object 3 can have more than three points to be measured 31, and the waiting point 31 does not necessarily have the same horizontal position.

復請參閱第3圖所示,該等針座22係設於該承載台21上方,其上分別設有一探針221,該探針221之針尖係向下延伸,又,各該針座22分別與各該第二驅動裝置25相連接,以能分別被各該第二驅動裝置25帶動,而沿垂直向或水平向位移,以調整各該探針221之針尖對應該承載台21之位置,另,當各該探針221之針尖位在對應於各該待測點31(如第4圖所示)的位置時,該第一驅動裝置24能夠驅動該承載台21向上位移,而使各該探針221之針尖抵靠至對應之待測點31,或者,各該第二驅動裝置25能夠驅動各該針座22向下位移,而使各該探針221之針尖抵靠至對應之待測點31,以進行後續的點測作業(如:供應電流)。 Referring to FIG. 3, the needle holders 22 are disposed above the loading platform 21, and a probe 221 is disposed on the needle 221. The needle tip of the probe 221 extends downward, and each of the needle holders 22 is further Each of the second driving devices 25 is connected to be driven by each of the second driving devices 25 to be vertically or horizontally displaced to adjust the position of the tip of each of the probes 221 corresponding to the carrying platform 21. In addition, when the tip of each of the probes 221 is located at a position corresponding to each of the points 31 to be measured (as shown in FIG. 4), the first driving device 24 can drive the loading table 21 to be displaced upward, so that The needle tips of the probes 221 abut against the corresponding points 31 to be tested, or each of the second driving devices 25 can drive each of the needle holders 22 to be displaced downward, so that the needle tips of the probes 221 abut against the corresponding points. Point 31 to be tested for subsequent spotting operations (eg, supply current).

復請參閱第3圖所示,在該實施例中,該控制單元23分別與該第一驅動裝置24及該等第二驅動裝置25相電氣連接,以使該第一驅動裝置24能驅動該承載台21位移位置,及使該等第二驅動裝置25能分別驅動對應之該等針座22之位移位置,另,該攝像單元26係位在該承載台21及該等針座22之側方(如:斜側上方或斜測下方),以能同時擷取該承載台21(或待測物3)與探針221之影像,以供該控制單元23能據以判斷出待測物3與該等探針221之位置,惟,在本發明之其它實施例中,該攝像單元26能夠在該承載台21之正上方,而非一定需同時擷取該承載台21(或待測物3)與探針221之影像,或者,為能愈加精準地判斷出待測物3與該等探針221之位置,業者能夠設有複數個攝像單元26,其中一個攝像單元26能位在該承載台21之上方,另一攝像單元26位於該等針座22之下方,且鄰近該承載台21側緣之位置,以能精確地擷取到針尖影像,如此,該控制單元23便能夠根據該等攝像單元26的截取影像,而準確地計算出該等探針221之針尖位置,及該等探針221與待測物3間的距離。 Referring to FIG. 3, in the embodiment, the control unit 23 is electrically connected to the first driving device 24 and the second driving device 25, respectively, so that the first driving device 24 can drive the The position of the loading table 21 is displaced, and the second driving device 25 can respectively drive the displacement positions of the corresponding needle holders 22, and the imaging unit 26 is positioned on the side of the loading table 21 and the needle holders 22 a square (eg, obliquely above or obliquely below) to simultaneously capture images of the carrier 21 (or the object to be tested 3) and the probe 221 for the control unit 23 to determine the object to be tested 3 and the position of the probes 221, however, in other embodiments of the present invention, the camera unit 26 can be directly above the carrier 21, rather than necessarily having to simultaneously capture the carrier 21 (or to be tested) 3) and the image of the probe 221, or in order to more accurately determine the position of the object to be tested 3 and the probes 221, the operator can be provided with a plurality of camera units 26, one of which can be located at Above the carrying platform 21, another camera unit 26 is located below the needle holder 22 and adjacent to the carrier 21 The position of the edge is such that the tip image can be accurately captured. Thus, the control unit 23 can accurately calculate the position of the tip of the probe 221 according to the captured image of the camera unit 26, and the probe The distance between the needle 221 and the object to be tested 3.

復請參閱第3及4圖所示,該壓力感測單元27(如:應變 規、光學應變計...等)係與該控制單元23相電氣連接,在該實施例中,二個壓力感測單元27分別設在該等針座22上,以能感測出探針221施加至待測點31上的點測壓力,惟,在本發明之其它實施例中,該壓力感測單元27亦可設在承載台21或其它元件上,或者該壓力感測單元27能為一非接觸式影像測量儀,其能拍攝針座22或探針221之變形量,並根據前述變形量計算出探針221施加至待測點31上的點測壓力,故,只要該壓力感測單元27能夠取得探針221施加至待測點31上的點測壓力,並能將前述點測壓力傳送至控制單元23,即為本發明所述之壓力感測單元27,合先陳明。 Please refer to Figures 3 and 4 for the pressure sensing unit 27 (eg strain The gauge, optical strain gauge, etc. are electrically connected to the control unit 23. In this embodiment, two pressure sensing units 27 are respectively disposed on the needle holders 22 to sense the probes. 221 is applied to the spotting pressure on the point to be tested 31. However, in other embodiments of the present invention, the pressure sensing unit 27 may also be disposed on the carrier 21 or other components, or the pressure sensing unit 27 can It is a non-contact image measuring instrument capable of taking the deformation amount of the needle holder 22 or the probe 221, and calculating the spotting pressure applied by the probe 221 to the point to be measured 31 according to the aforementioned deformation amount, so that the pressure is as long as the pressure The sensing unit 27 can obtain the spotting pressure applied by the probe 221 to the point to be measured 31, and can transmit the aforementioned point pressure to the control unit 23, that is, the pressure sensing unit 27 of the present invention. Bright.

請參閱第3及5圖所示,在該實施例中,當工作人員進行點測程序時,該控制單元23會執行一等高調校程序4A,其中,當該控制單元23接收到該攝像單元26所傳來之影像資料後,其會根據前述影像資料而判斷出該等探針221之針尖位置(或針尖高度),並產生之一調校資料,之後,該控制單元23會根據該調校資料驅動該等第二驅動裝置25,使得該等第二驅動裝置25能帶動對應之針座22,以沿水平向或垂直向調校該等探針221之針尖的相對位置,令該等探針221之針尖位置能保持在同一高度。 Referring to FIGS. 3 and 5, in this embodiment, when the worker performs a test procedure, the control unit 23 executes a contour adjustment program 4A, wherein when the control unit 23 receives the camera After the image data transmitted by the unit 26, the needle tip position (or the needle tip height) of the probes 221 is determined according to the image data, and a calibration data is generated, and then the control unit 23 according to the The calibration data drives the second driving devices 25 such that the second driving devices 25 can drive the corresponding needle holders 22 to adjust the relative positions of the probe tips of the probes 221 horizontally or vertically. The tip position of the probe 221 can be maintained at the same height.

惟,除了前述之等高調校程序以外,復請參閱第3及4圖所示,在本發明之其它實施例中,該等高調校程序亦可採用下列其它方式進行,例如:該控制單元23接收到該攝像單元26所傳來之影像資料後,係會根據該等探針221之針尖與對應之該等待測點31間之距離,產生該調校資料,並根據該調校資料驅動該等第二驅動裝置25,以沿水平向或垂直向調校該等探針221之針尖的相對位置,使得該等探針221之針尖與對應之該等待測點31間之距離能保持在同一距離,如此,業者即能使該等探針221抵靠至對應之待測點31時,不會產生過大的點測壓力,以避免待測物3損壞,另外,在此特別一提者,僅管該等探針221之針尖與對應待測點31保持在同一距離,但受到針尖精度、長短、彈性或其它影響,並非能確保該等待測點31所受到之點測壓力均相同,合先陳明。再者,業者亦能夠在該承載台21上未有待測物3時,使該等探針221之針尖先行抵壓該承載台21,或是在該承載台21上另行放置一平台,且使該等探針221之針尖先行抵壓該平台,嗣,當使得控制單元23接收到壓力感測單元27之感測數值,即 代表該等探針221之針尖已抵壓至承載台21(或平台),該控制單元23便會驅動該等第二驅動裝置25,使得該等第二驅動裝置25能帶動對應之針座22位移,令該等探針221之針尖位置能保持在同一高度,又,前述之壓力感測單元27之感測數值僅是代表該等探針221之針尖抵壓至承載台21(或平台),但並非指該等探針221之針尖的下壓力量均相同,合先敘明。 However, in addition to the aforementioned contour adjustment procedure, as shown in FIGS. 3 and 4, in other embodiments of the present invention, the height adjustment procedure may be performed in other manners, such as: After receiving the image data transmitted by the camera unit 26, the unit 23 generates the calibration data according to the distance between the needle tip of the probe 221 and the corresponding waiting point 31, and according to the calibration data. The second driving device 25 is driven to adjust the relative positions of the tips of the probes 221 in a horizontal or vertical direction so that the distance between the tips of the probes 221 and the corresponding waiting points 31 can be maintained. At the same distance, in this way, the operator can make the probes 221 abut against the corresponding point 31 to be tested, and does not generate excessive point pressure to avoid damage of the object to be tested 3, and in particular, However, although the tip of the probes 221 is kept at the same distance from the corresponding point 31 to be measured, but the accuracy, length, elasticity or other influence of the tip is not ensured that the pressures to be measured by the waiting point 31 are the same. , together with Chen Ming. Moreover, the operator can also make the tip of the probes 221 first press the loading platform 21 when the object to be tested 3 is not present on the carrying platform 21, or place a platform on the loading platform 21, and The tip of the probes 221 is pressed against the platform first, and when the control unit 23 is caused to receive the sensed value of the pressure sensing unit 27, The needle tips representing the probes 221 have been pressed against the carrier 21 (or platform), and the control unit 23 drives the second driving devices 25 so that the second driving devices 25 can drive the corresponding needle holders 22 The displacement causes the tip positions of the probes 221 to be maintained at the same height. Moreover, the sensed values of the pressure sensing unit 27 are only that the needle tips of the probes 221 are pressed against the carrier 21 (or platform). However, it does not mean that the amount of depression of the tip of the probes 221 is the same, which is described first.

復請參閱第3及5圖所示,在該實施例中,當前述等高調校程序4A完成後,該控制單元23會執行一等壓調校程序4B,其中,該控制單元23會驅動該第一驅動裝置24,該第一驅動裝置24帶動該承載台21位移,使得該等探針221之針尖能分別觸壓對應之該等待測點31,惟,在本發明之其它實施例中,當該控制單元23執行該等壓調校程序4B時,其能先驅動該等第二驅動裝置25,令該等第二驅動裝置25帶動對應之針座22,使得該等探針221之針尖能分別觸壓對應之該等待測點31。嗣,該控制單元23能接收該壓力感測單元27所感測到之該探針221施加至對應之該待測點31之一點測壓力,之後,該控制單元23會計算出該等點測壓力間之一差值,且判斷該差值是否位於內建之一門檻值範圍內,舉例而言,該控制單元23內建之門檻值範圍為0.8~1.2公克,且該等探針221之針尖分別觸壓對應之該等待測點31時,理想上會對待測點31產生5公克之點測壓力,因此,復請參閱第3及4圖所示,當待測點31A之點測壓力為5公克,待測點31B之點測壓力為4公克時,由於該差值(3公克減2公克)位於該門檻值範圍內時,即表示各該待測點31所承受之點測壓力符合業者之預期點測壓力,該控制單元23係完成該等壓調校程序4B;另,當該差值非位在該門檻值範圍內時(如:待測點31A之點測壓力為5公克,待測點31B之點測壓力為3公克),則表示其中一個待測點31承受過大或過小之點測壓力,此時,該控制單元23會驅動各該第二驅動裝置25,各該第二驅動裝置25即會帶動對應之針座22,以進一步調校各該等探針221之針尖與對應之各該待測點31間之距離,直到該差值落在該門檻值之範圍內,則該控制單元23即完成該等壓調校程序4B。 Referring to Figures 3 and 5, in this embodiment, after the contour adjustment program 4A is completed, the control unit 23 executes an equal pressure calibration procedure 4B, wherein the control unit 23 drives The first driving device 24 drives the loading table 21 to be displaced, so that the needle tips of the probes 221 can respectively touch the corresponding waiting point 31, but in other embodiments of the present invention When the control unit 23 executes the equal pressure calibration program 4B, it can drive the second driving devices 25 first, and the second driving devices 25 drive the corresponding needle holders 22 so that the probes 221 The needle tip can respectively press the corresponding waiting point 31. The control unit 23 can receive the probe pressure applied by the pressure sensing unit 27 to the corresponding point to be measured 31, and then the control unit 23 calculates the pressure between the points. a difference value, and determining whether the difference is within a threshold value of the built-in threshold. For example, the threshold value built in the control unit 23 ranges from 0.8 to 1.2 grams, and the tip of the probes 221 are respectively When the touch pressure corresponds to the waiting point 31, it is ideal to generate a measuring pressure of 5 grams for the measuring point 31. Therefore, as shown in Figures 3 and 4, when the point to be measured 31A is 5 In grams, when the point pressure to be measured 31B is 4 grams, since the difference (3 grams minus 2 grams) is within the threshold value, it means that the point pressures to be measured by the points 31 to be tested are in compliance with the manufacturer. The expected pressure is measured, the control unit 23 completes the equal pressure calibration procedure 4B; and when the difference is not within the threshold range (eg, the point pressure to be measured 31A is 5 grams, If the spotting pressure of the point to be measured 31B is 3 gram, it means that one of the points to be tested 31 is too large or too small. The pressure is measured. At this time, the control unit 23 drives each of the second driving devices 25, and each of the second driving devices 25 drives the corresponding needle holder 22 to further adjust the tip of each of the probes 221. Corresponding to the distance between each of the points 31 to be measured, until the difference falls within the range of the threshold value, the control unit 23 completes the equal pressure calibration procedure 4B.

惟,本發明並非僅限制於前述之判斷差值方式,在本發明之其它實施例中,該控制單元23在接收到該等點測壓力後,亦可將該等點測 壓力分別與一點測門檻值範圍相比較,以判斷該等點測壓力是否位於該點測門檻值範圍內,舉例而言,該控制單元23內建之點測門檻值範圍為4~5公克,復請參閱第3及4圖所示,當待測點31A之點測壓力為5公克,待測點31B之點測壓力為4公克時,由於該等待測點31A、31B之點測壓力均位於該點測門檻值範圍,即完成該等壓調校程序4B;當待測點31A之點測壓力為5公克,待測點31B之點測壓力為3公克時,由於待測點31B之點測壓力並非位於該點測門檻值範圍,該控制單元23便會驅動該第二驅動裝置25,以調校探針221之針尖與對應待測點31B間之距離,直到點測壓力落在該點測門檻值範圍內,則該控制單元23即完成該等壓調校程序4B。 However, the present invention is not limited to the foregoing method for determining the difference. In other embodiments of the present invention, the control unit 23 may also perform the measurement after receiving the test pressure. The pressure is respectively compared with the range of the threshold value of the one-step measurement to determine whether the measured pressure is within the range of the threshold value. For example, the built-in point measurement threshold of the control unit 23 ranges from 4 to 5 grams. Please refer to Figures 3 and 4, when the measured pressure of the point 31A to be measured is 5 grams, and the point pressure of the point 31B to be measured is 4 grams, the pressure measured by the waiting points 31A, 31B At the point of the threshold value of the measurement, the pressure calibration procedure 4B is completed; when the point pressure of the point to be measured 31A is 5 grams, and the point pressure of the point 31B to be measured is 3 grams, due to the point 31B to be measured The spotting pressure is not located in the range of the threshold value, and the control unit 23 drives the second driving device 25 to adjust the distance between the tip of the probe 221 and the corresponding point to be measured 31B until the point pressure falls. Within the range of the threshold value, the control unit 23 completes the equal pressure calibration procedure 4B.

在此特別聲明者,在本發明之其它實施例中,業者亦可省略等高調校程序4A,而僅使用等壓調校程序4B,以提高點測效率,合先敘明。綜上所述可知,復請參閱第3~5圖所示,無論待測物(如:LED晶粒)上之複數個待測點31的水平位置是否相同,或無論該等探針221之精度、長短或彈性是否相同,該點測裝置2均能根據該等壓調校程序4B中,各該探針221之點測壓力的大小,適當地調整各該探針221的水平向或垂直向之位置,以使各該探針221與對應之各該待測點31間的距離能分別保持在一最佳之初始距離,令在後續點測過程中,該等探針221分別施加至對應之該等待測點31之點測壓力數值能保持在完全相同或近乎相同之程度,以有效避免因點測壓力過大或過小,而造成待測物損壞或影響點測之精準度。 In particular, in other embodiments of the present invention, the operator may also omit the contour adjustment procedure 4A and only use the equal pressure calibration procedure 4B to improve the efficiency of the spot measurement. In summary, it can be seen that, as shown in FIGS. 3~5, whether the horizontal positions of the plurality of points to be tested 31 on the object to be tested (eg, LED dies) are the same, or regardless of the probes 221 Whether the accuracy, the length, or the elasticity are the same, the pointing device 2 can appropriately adjust the horizontal or vertical direction of each of the probes 221 according to the magnitude of the pressure of the probes 221 in the equal pressure calibration program 4B. Positioned so that the distance between each of the probes 221 and the corresponding points 31 to be measured can be respectively maintained at an optimal initial distance, so that the probes 221 are respectively applied to the subsequent spotting process. Corresponding to the point measurement pressure of the waiting point 31 can be kept at the same or nearly the same level, so as to effectively avoid the damage of the object to be tested or the accuracy of the point measurement due to excessive or too small pressure.

按,以上所述,僅係本發明之較佳實施例,惟,本發明所主張之權利範圍,並不侷限於此,按凡熟悉該項技藝人士,依據本發明所揭露之技術內容,可輕易思及之等效變化,均應屬不脫離本發明之保護範疇。 The above is only the preferred embodiment of the present invention, but the scope of the claims of the present invention is not limited thereto, and according to those skilled in the art, according to the technical content disclosed in the present invention, Equivalent changes that are easily considered are within the scope of protection of the invention.

4A‧‧‧等高調校程序 4A‧‧‧etc.

4B‧‧‧等壓調校程序 4B‧‧‧Isostatic adjustment procedure

Claims (10)

一種根據複數個待測點之水平位置調整探針之位移距離的方法,該方法係應用至一點測裝置上,該點測裝置包括一承載台、複數個針座及一控制單元,其中,該承載台之頂部平置有至少一待測物,該承載台能被一第一驅動裝置帶動位移,該待測物上至少有複數個待測點,各該針座係設於該承載台上方,能分別被一第二驅動裝置帶動位移,各該針座上分別設有一探針,該探針能隨著該承載台或該針座之位移,而抵靠至對應之待測點,該控制單元分別與該第一驅動裝置及該等第二驅動裝置相電氣連接,以使該第一驅動裝置及該等第二驅動裝置能分別驅動對應之該承載台與該等針座之位移位置,該方法係使該控制單元執行下列步驟:執行一等壓調校程序,驅動該等第二驅動裝置或該第一驅動裝置,使該等探針之針尖分別觸壓對應之該等待測點,且分別接收一壓力感測單元所感測到之該探針施加至對應之該待測點之一點測壓力;及計算出該等點測壓力間之一差值,且判斷該差值是否位於內建之一門檻值範圍內,若是,即完成該等壓調校程序;否則,驅動各該第二驅動裝置,以調校各該探針之針尖與對應之各該待測點間之距離,直到該差值落在該門檻值範圍內,始完成該等壓調校程序。 A method for adjusting a displacement distance of a probe according to a horizontal position of a plurality of points to be measured, the method is applied to a point measuring device, the measuring device comprising a carrying platform, a plurality of needle holders and a control unit, wherein The top of the carrying platform is flat with at least one object to be tested, and the loading table can be displaced by a first driving device. The object to be tested has at least a plurality of points to be tested, and the needle holder is disposed above the carrying platform. The probes can be respectively driven by a second driving device, and each of the needle holders is respectively provided with a probe, and the probe can abut against the corresponding point to be tested according to the displacement of the carrier or the needle holder. The control unit is electrically connected to the first driving device and the second driving device, respectively, so that the first driving device and the second driving device can respectively drive the corresponding displacement positions of the loading platform and the needle holders The method is such that the control unit performs the following steps: performing an equal pressure calibration procedure, driving the second driving device or the first driving device, respectively, so that the tip of the probes respectively touch the corresponding waiting point And separately a pressure sensing unit senses that the probe is applied to a corresponding one of the points to be measured; and calculates a difference between the measured pressures, and determines whether the difference is located in one of the built-in Within the threshold value range, if yes, the pressure calibration procedure is completed; otherwise, each of the second driving devices is driven to adjust the distance between the tip of each probe and the corresponding point to be measured until the difference The value falls within the threshold value and the equal pressure calibration procedure is completed. 如請求項1所述之方法,其中,在該控制單元執行該等壓調校程序之前,尚先執行一等高調校程序,該等高調校程 序係該控制單元根據至少一攝像單元所擷取到之該等探針之針尖位置,產生對應之一調校資料,再根據該調校資料驅動該等第二驅動裝置,以沿水平向或垂直向調校該等探針之針尖的相對位置,令該等探針之針尖位置保持在同一高度。 The method of claim 1, wherein before the control unit executes the equal pressure calibration procedure, a first high calibration procedure is performed first, and the high-profile calibration procedures are performed. The control unit generates corresponding calibration data according to the position of the tip of the probes captured by the at least one camera unit, and then drives the second driving devices according to the calibration data to be horizontally or The relative positions of the tips of the probes are adjusted vertically to maintain the tip positions of the probes at the same height. 如請求項1所述之方法,其中,在該控制單元執行該等壓調校程序之前,尚先執行一等高調校程序,該等高調校程序係該控制單元根據至少一攝像單元所擷取到之該等探針之針尖與對應之該等待測點間之距離,產生對應之一調校資料,再根據該調校資料驅動該等第二驅動裝置,以沿水平向或垂直向調校該等探針之針尖的相對位置,令該等探針之針尖與對應之該等待測點間之距離能保持在同一距離。 The method of claim 1, wherein before the control unit executes the equal pressure calibration procedure, a first calibration procedure is performed, the high calibration procedure being based on the at least one camera unit Extracting the distance between the tip of the probe and the corresponding waiting point, generating a corresponding calibration data, and driving the second driving device according to the calibration data to be horizontally or vertically The relative positions of the tips of the probes are adjusted so that the distance between the tips of the probes and the corresponding waiting points can be kept at the same distance. 如請求項1所述之方法,其中,在該承載台上未放置待測物,且該控制單元執行該等壓調校程序之前,尚先執行一等高調校程序,該等高調校程序係該控制單元接收到該壓力感測單元產生之感測數值後,即代表該等探針之針尖已抵壓至該承載台或一平台,再驅動該等第二驅動裝置,以沿水平向或垂直向調校該等探針之針尖的相對位置,令該等探針之針尖位置保持在同一高度。 The method of claim 1, wherein the object to be tested is not placed on the platform, and the control unit performs a first calibration procedure before performing the equal pressure calibration procedure. After the control unit receives the sensed value generated by the pressure sensing unit, it means that the tip of the probe has been pressed against the carrying platform or a platform, and then the second driving device is driven to be horizontal The relative positions of the tips of the probes are adjusted to or vertically such that the tip positions of the probes are maintained at the same height. 如請求項1、2、3或4所述之方法,其中,該等待測點具有至少一個不相同的水平位置。 The method of claim 1, 2, 3 or 4, wherein the waiting point has at least one different horizontal position. 一種根據複數個待測點之水平位置調整探針之位移距離的方法,該方法應用至一點測裝置上,該點測裝置包括一承 載台、複數個針座及一控制單元,其中,該承載台之頂部平置有至少一待測物,該承載台能被一第一驅動裝置帶動位移,該待測物上至少有複數個待測點,各該針座係設於該承載台上方,能分別被一第二驅動裝置帶動位移,各該針座上分別設有一探針,該探針能隨著該承載台或該針座之位移,而抵靠至對應之待測點,該控制單元分別與該第一驅動裝置及該等第二驅動裝置相電氣連接,以使該第一驅動裝置及該等第二驅動裝置能分別驅動對應之該承載台與該等針座之位移位置,該方法係使該控制單元執行下列步驟:執行一等壓調校程序,驅動該等第二驅動裝置或該第一驅動裝置,使該等探針之針尖分別觸壓對應之該等待測點,且分別接收一壓力感測單元所感測到之該探針施加至對應之該待測點之一點測壓力;及判斷各該點測壓力是否分別位於內建之一點測門檻值範圍內,若是,即完成該等壓調校程序;否則,驅動各該第二驅動裝置,以調校各該探針之針尖與對應之各該待測點間之距離,直到各該點測壓力分別落在該點測門檻值範圍內,始完成該等壓調校程序。 A method for adjusting a displacement distance of a probe according to a horizontal position of a plurality of points to be measured, the method being applied to a point measuring device, the point measuring device comprising a bearing a loading platform, a plurality of needle holders and a control unit, wherein the top of the loading platform is flat with at least one object to be tested, and the loading platform can be displaced by a first driving device, and the object to be tested has at least a plurality of objects Each of the needle holders is disposed above the loading platform and can be respectively displaced by a second driving device. Each of the needle holders is respectively provided with a probe, and the probe can be along with the loading platform or the needle Displacement of the seat and abutting to the corresponding point to be tested, the control unit is electrically connected to the first driving device and the second driving device, respectively, so that the first driving device and the second driving device can Driving the corresponding displacement positions of the loading platform and the needle holders respectively, the method is such that the control unit performs the following steps: performing an equal pressure calibration procedure, driving the second driving devices or the first driving device, so that The probe tips of the probes respectively touch the corresponding waiting points, and respectively receive a probe pressure sensed by the pressure sensing unit and applied to one of the corresponding points to be measured; and determine each of the points Whether the pressure is built in separately Within the range of the threshold value, if yes, the pressure calibration procedure is completed; otherwise, each of the second driving devices is driven to adjust the distance between the tip of each probe and the corresponding point to be measured until Each of the point-measuring pressures falls within the range of the point-measuring threshold, and the equal-pressure calibration procedure is completed. 如請求項6所述之方法,其中,在該控制單元執行該等壓調校程序之前,尚先執行一等高調校程序,該等高調校程序係根據一攝像單元所擷取到之該等探針之針尖位置,產生對應之一調校資料,再根據該調校資料驅動該等第二驅 動裝置,以沿水平向或垂直向調校該等探針之針尖的相對位置,令該等探針之針尖位置保持在同一高度。 The method of claim 6, wherein before the control unit executes the equal pressure calibration procedure, the first calibration procedure is performed first, and the high calibration procedure is obtained according to a camera unit. Positioning the tip of the probes to generate a corresponding calibration data, and driving the second drivers according to the calibration data The device adjusts the relative positions of the tips of the probes in a horizontal or vertical direction to maintain the tip positions of the probes at the same height. 如請求項6所述之方法,其中,在該控制單元執行該等壓調校程序之前,尚先執行一等高調校程序,該等高調校程序係根據一攝像單元所擷取到之該等探針之針尖與對應之該等待測點間之距離,產生對應之一調校資料,再根據該調校資料驅動該等第二驅動裝置,以沿水平向或垂直向調校該等探針之針尖的相對位置,令該等探針之針尖與對應之該等待測點間之距離能保持在同一距離。 The method of claim 6, wherein before the control unit executes the equal pressure calibration procedure, the first calibration procedure is performed first, and the high calibration procedure is obtained according to a camera unit. A distance between the tip of the probe and the corresponding waiting point is generated, corresponding to one calibration data, and then the second driving device is driven according to the calibration data to adjust the horizontal or vertical direction The relative positions of the probe tips are such that the distance between the tip of the probe and the corresponding waiting point can be kept at the same distance. 如請求項6所述之方法,其中,在該承載台上未放置待測物,且該控制單元執行該等壓調校程序之前,尚先執行一等高調校程序,該等高調校程序係該控制單元接收到該壓力感測單元產生之感測數值後,即代表該等探針之針尖已抵壓至該承載台或一平台,再驅動該等第二驅動裝置,以沿水平向或垂直向調校該等探針之針尖的相對位置,令該等探針之針尖位置保持在同一高度。 The method of claim 6, wherein the object to be tested is not placed on the platform, and the control unit performs a first-level calibration procedure before performing the equal-pressure calibration procedure. After the control unit receives the sensed value generated by the pressure sensing unit, it means that the tip of the probe has been pressed against the carrying platform or a platform, and then the second driving device is driven to be horizontal The relative positions of the tips of the probes are adjusted to or vertically such that the tip positions of the probes are maintained at the same height. 如請求項6、7、8或9所述之方法,其中,該等待測點具有至少一個不相同的水平位置。 The method of claim 6, 7, 8, or 9, wherein the waiting point has at least one different horizontal position.
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