TW201624605A - Wafer tray - Google Patents

Wafer tray Download PDF

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Publication number
TW201624605A
TW201624605A TW104128013A TW104128013A TW201624605A TW 201624605 A TW201624605 A TW 201624605A TW 104128013 A TW104128013 A TW 104128013A TW 104128013 A TW104128013 A TW 104128013A TW 201624605 A TW201624605 A TW 201624605A
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Taiwan
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wafer
carrier
tray
cover
tab
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TW104128013A
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Chinese (zh)
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TWI584405B (en
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Zhao Zhang
ru-chun Liu
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Advanced Micro Fab Equip Inc
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Abstract

Disclosed is a wafer tray comprising a carrier tray and cover embedded on upper surface of carrier tray. Upper surface of the carrier tray has a plurality of downward recess wafer bearing region. A portion of sidewall top of each wafer bearing region has a first convex tongue extending to bearing region center. The first convex tongue is along edge of bearing region for covering a first partial arc outer peripheral edge of wafer. Edge of the cover has a second convex tongue. The second convex tongue is applicable of covering a second partial arc outer peripheral edge of a plurality of wafers. The first and second partial arc outer peripheral edges commonly surround whole outer peripheral edge of wafer for putting pressure on wafer so as to prevent warpage of wafer; in addition, bottom wall and sidewall of each wafer bearing region and a first convex tongue connected to sidewall are integrated. Wafer is heated by bottom wall. The first convex tongue and bottom wall are integrated so that temperature of both is the same. The first convex tongue would not influence scan result due to different temperature in scanning process for wafer tray.

Description

晶圓托盤Wafer tray

本發明涉及半導體技術領域,特別涉及一種晶圓托盤。The present invention relates to the field of semiconductor technologies, and in particular, to a wafer tray.

半導體器件製作過程中的一些製程,需將晶圓承載在晶圓托盤上完成。例如金屬有機化合物化學氣相沉積(Metal Organic Chemical VaporDeposition,MOCVD)以其成長易控制、可成長純度很高的材料、磊晶層大面積均勻性良好等優點,逐漸用於製造高亮度LED晶片。Some processes in the fabrication of semiconductor devices require wafers to be carried on wafer trays. For example, Metal Organic Chemical Vapor Deposition (MOCVD) is gradually used to manufacture high-brightness LED chips due to its advantages of easy growth control, high purity and high uniformity of the epitaxial layer.

在MOCVD腔室內,為使得原料氣體分解,從而沉積在晶圓托盤上的晶圓表面,該腔室內還具有加熱器。In the MOCVD chamber, a heater is deposited in the chamber for the decomposition of the material gas to deposit on the wafer surface on the wafer tray.

習知技術中,晶圓托盤上承載的晶圓具有複數個,該複數個晶圓在受熱過程中,容易出現翹曲。In the prior art, a plurality of wafers carried on a wafer tray have a plurality of wafers, and the plurality of wafers are prone to warpage during heating.

另外,如何通過掃描晶圓托盤,以精確獲得其上的晶圓的溫度也是本領域技術難題之一。這是因為:習知技術中為了防止晶圓翹曲,會在托盤上表面設置一個或複數個蓋板,這些蓋板圍繞所有的晶圓的外周緣,在完成沉積後先移除這些蓋板,再取出完成沉積的晶圓;由於這些蓋板是後加的,所有蓋板與支撐晶圓的托盤上不可避免的存在縫隙,而氣相沉積反應腔通常氣壓很低接近真空,所有熱量只能通過輻射及傳導傳遞,無法通過對流進行傳遞,所以這些不均勻的縫隙會導致蓋板與下方的托盤溫度差別很大而且蓋板上的溫度分佈也不均勻,進一步會干擾對晶圓上溫度的測量及調節。In addition, how to accurately obtain the temperature of the wafer on the wafer tray by scanning the wafer tray is also one of the technical problems in the art. This is because: in order to prevent wafer warpage in the prior art, one or more cover plates are disposed on the upper surface of the tray, and the cover plates surround the outer circumferences of all the wafers, and the cover plates are removed after the deposition is completed. Then, the deposited wafer is removed; since the cover plates are added, there is inevitably a gap between all the cover plates and the tray supporting the wafer, and the vapor deposition reaction chamber is usually at a low pressure close to the vacuum, and all the heat is only It can be transmitted by radiation and conduction, and cannot be transmitted by convection. Therefore, these uneven gaps will cause the temperature difference between the cover and the lower tray to be large and the temperature distribution on the cover is not uniform, which will further interfere with the temperature on the wafer. Measurement and adjustment.

有鑑於此,本發明提供一種新的晶圓托盤,能避免晶圓翹曲,且可通過掃描,精確獲得其上的晶圓的溫度。In view of this, the present invention provides a new wafer tray which can avoid wafer warpage and can accurately obtain the temperature of the wafer thereon by scanning.

本發明實現的目的是避免晶圓翹曲,且可通過掃描,精確獲得其上的晶圓的溫度。The object of the invention is to avoid wafer warpage and to accurately obtain the temperature of the wafer thereon by scanning.

為實現上述目的,本發明的一方面提供一種晶圓托盤,包含:To achieve the above object, an aspect of the present invention provides a wafer tray comprising:

承載盤,上表面具有複數個向下凹陷的晶圓承載區,所述晶圓承載區用於放置晶圓,每一晶圓承載區的部分側壁頂部具有伸向承載區中心的第一凸舌,每一晶圓承載區的底壁、側壁以及與所述側壁連接的第一凸舌一體成型,其中第一凸舌沿所述承載區的邊緣適於覆蓋晶圓的第一部分弧形外周緣,所述第一部分弧形外周緣小於等於晶圓外周緣的一半;以及a carrier disk having a plurality of downwardly recessed wafer carrying regions on the upper surface, the wafer carrying regions for placing wafers, and a portion of the sidewalls of each of the wafer carrying regions has a first tab extending toward a center of the carrying region a bottom wall, a side wall of each wafer carrying area, and a first tab connected to the side wall, wherein the first tab is adapted to cover a first outer peripheral edge of the wafer along an edge of the carrying area The first portion of the curved outer periphery is less than or equal to half of the outer periphery of the wafer;

蓋板,嵌在所述承載盤的上表面,所述蓋板的邊緣具有第二凸舌,所述第二凸舌適於覆蓋所述複數個晶圓的第二部分弧形外周緣,所述第一及第二部分弧形外周緣共同圍繞所述晶圓的整個外周緣。a cover plate embedded on an upper surface of the carrier tray, an edge of the cover plate having a second tab, the second tab being adapted to cover a curved outer periphery of the second portion of the plurality of wafers The first and second portions of the curved outer periphery collectively surround the entire outer periphery of the wafer.

較佳地,所述蓋板為一塊,所述蓋板上的第二凸舌與所述承載盤上的第一凸舌互補,用於覆蓋所述晶圓的整個外周緣;Preferably, the cover plate is a piece, and the second tab on the cover plate is complementary to the first tab on the carrier plate for covering the entire outer periphery of the wafer;

或所述蓋板由多塊拼接而成,所述多塊蓋板上的第二凸舌共同與所述承載盤上的第一凸舌互補,用於覆蓋所述晶圓的整個外周緣。Or the cover plate is formed by splicing a plurality of pieces, and the second tongues on the plurality of cover plates are complementary to the first tongue on the carrier plate for covering the entire outer circumference of the wafer.

較佳地,所述蓋板嵌在所述承載盤的中心區域,所述複數個晶圓承載區圍繞所述蓋板設置,所述蓋板邊緣的第二凸舌沿背離承載盤中心方向延伸,所述晶圓承載區上的第一凸舌沿朝向承載盤中心方向延伸;或所述蓋板圍繞所述複數個晶圓承載區設置,嵌在所述承載盤的邊緣區域,所述蓋板邊緣的第二凸舌沿朝向承載盤中心方向延伸,所述晶圓承載區上的第一凸舌沿背離承載盤中心方向延伸。Preferably, the cover plate is embedded in a central area of the carrier tray, the plurality of wafer bearing areas are disposed around the cover plate, and the second tab of the cover plate edge extends away from the center of the carrier disk. a first tab on the wafer carrying area extending toward a center of the carrying tray; or the cover is disposed around the plurality of wafer carrying areas, embedded in an edge region of the carrying tray, the cover The second tab of the edge of the board extends toward the center of the carrier, and the first tab on the wafer carrying area extends away from the center of the carrier.

較佳地,所述承載盤上表面具有複數個凹槽,每一凹槽形成一所述晶圓承載區,所述蓋板與所述承載盤固定或未固定。Preferably, the upper surface of the carrier disk has a plurality of grooves, each groove forming a wafer carrying area, and the cover plate is fixed or not fixed to the carrier.

較佳地,晶圓托盤還包含複數個晶圓載盤,所述晶圓載盤位於所述承載盤的上表面,每一晶圓載盤形成一所述晶圓承載區,所述蓋板與所述承載盤固定。Preferably, the wafer tray further comprises a plurality of wafer carriers, the wafer carrier is located on an upper surface of the carrier, each wafer carrier forming a wafer carrying area, the cover and the The carrier tray is fixed.

較佳地,所述複數個晶圓載盤固定或未固定在所述承載盤的上表面。Preferably, the plurality of wafer carriers are fixed or not fixed on an upper surface of the carrier.

較佳地,所述蓋板通過螺釘固定在所述承載盤的上表面。Preferably, the cover plate is fixed to the upper surface of the carrier tray by screws.

較佳地,所述晶圓承載區具有底壁,所述底壁具有相背離的上表面與下表面,所述上表面為晶圓承載面,所述下表面呈平面、凹面、凸面或呈臺階狀。Preferably, the wafer carrying area has a bottom wall having opposite upper and lower surfaces, the upper surface being a wafer bearing surface, and the lower surface is planar, concave, convex or Stepped.

較佳地,所述蓋板以及所述承載盤適於一體旋轉:a)轉軸連接在所述承載盤的中心,所述承載盤帶動所述蓋板旋轉;或b)所述轉軸連接在所述蓋板的中心,所述蓋板帶動所述承載盤旋轉,所述承載盤具有適於所述轉軸通過的孔。Preferably, the cover plate and the carrying tray are adapted to rotate integrally: a) the rotating shaft is connected to the center of the carrying tray, the carrying tray drives the cover to rotate; or b) the rotating shaft is connected at the In the center of the cover plate, the cover plate drives the carrier tray to rotate, and the carrier tray has a hole suitable for the passage of the rotating shaft.

較佳地,所述轉軸的橫截面呈方形或三角形,對於a),所述承載盤的中心相應地具有方形或三角形槽;對於b),所述蓋板的中心相應地具有方形或三角形槽。Preferably, the shaft has a square or triangular cross section, and for a), the center of the carrier has a square or triangular groove correspondingly; for b), the center of the cover has a square or triangular groove correspondingly. .

較佳地,對於a),所述承載盤的中心還具有擋塊,用於所述轉軸抵靠,所述蓋板上具有與所述擋塊匹配的鏤空區域。Preferably, for a), the center of the carrier tray further has a stop for the shaft to abut, and the cover has a hollowed area matching the stop.

較佳地,所述蓋板以及所述承載盤適於一體旋轉:a)轉軸連接在所述承載盤的中心,所述承載盤帶動所述複數個晶圓載盤以及所述蓋板旋轉;或b)所述轉軸連接在所述蓋板的中心,所述蓋板帶動所述複數個晶圓載盤以及所述承載盤旋轉,所述承載盤具有適於所述轉軸通過的孔。Preferably, the cover plate and the carrying tray are adapted to rotate integrally: a) a rotating shaft is coupled to the center of the carrying tray, the carrying tray drives the plurality of wafer carriers and the cover plate rotates; or b) the rotating shaft is connected at the center of the cover plate, the cover plate drives the plurality of wafer carriers and the carrier disk to rotate, the carrier disk has a hole suitable for the passage of the rotating shaft.

較佳地,所述轉軸的橫截面呈方形或三角形,對於a),所述承載盤的中心相應地具有方形或三角形槽;對於b),所述蓋板的中心相應地具有方形或三角形槽。Preferably, the shaft has a square or triangular cross section, and for a), the center of the carrier has a square or triangular groove correspondingly; for b), the center of the cover has a square or triangular groove correspondingly. .

較佳地,對於a),所述承載盤的中心還具有擋塊,用於所述轉軸抵靠,所述蓋板上具有與所述擋塊匹配的鏤空區域。Preferably, for a), the center of the carrier tray further has a stop for the shaft to abut, and the cover has a hollowed area matching the stop.

本發明的另一方面提供另外一種晶圓托盤,包含:Another aspect of the invention provides an additional wafer tray comprising:

複數個晶圓載盤,每一晶圓載盤具有一向下凹陷的晶圓承載區,所述晶圓承載區用於放置晶圓,每一晶圓承載區的部分側壁頂部具有伸向承載區中心的第一凸舌,每一晶圓承載區的底壁、側壁以及與所述側壁連接的第一凸舌一體成型,其中第一凸舌沿所述承載區的邊緣適於覆蓋晶圓的第一部分弧形外周緣,所述第一部分弧形外周緣小於等於晶圓外周緣的一半;以及a plurality of wafer carriers each having a downwardly recessed wafer carrying area for placing wafers, a portion of the sidewalls of each of the wafer carrying regions having a top portion extending toward the center of the carrying region a first tab, a bottom wall of each of the wafer carrying areas, a sidewall, and a first tab connected to the sidewall, wherein the first tab is adapted to cover the first portion of the wafer along an edge of the carrying region a curved outer periphery, the first portion of the curved outer periphery being less than or equal to half the outer periphery of the wafer;

蓋板,嵌在所述複數個晶圓載盤的上表面並暴露出所述複數個晶圓承載區,所述蓋板與所述複數個晶圓載盤固定,所述蓋板的邊緣具有第二凸舌,所述第二凸舌適於覆蓋所述複數個晶圓的第二部分弧形外周緣,所述第一及第二部分弧形外周緣共同圍繞所述晶圓的整個外周緣。a cover plate embedded on an upper surface of the plurality of wafer carriers and exposing the plurality of wafer carrying regions, the cover plate being fixed to the plurality of wafer carriers, the edge of the cover plate having a second a tab, the second tab adapted to cover a second portion of the curved outer periphery of the plurality of wafers, the first and second portions of the arcuate outer periphery collectively surrounding an entire outer periphery of the wafer.

較佳地,所述蓋板為一塊,所述蓋板上的第二凸舌與所述複數個晶圓載盤上的第一凸舌互補,用於覆蓋所述晶圓的整個外周緣; 或所述蓋板為多塊,所述多塊蓋板上的第二凸舌共同與所述複數個晶圓載盤上的第一凸舌互補,用於覆蓋所述晶圓的整個外周緣。Preferably, the cover plate is a block, and the second tab on the cover plate is complementary to the first tab on the plurality of wafer carriers for covering the entire outer periphery of the wafer; or The cover plate is a plurality of blocks, and the second tabs on the plurality of cover plates are complementary to the first tabs on the plurality of wafer carriers for covering the entire outer periphery of the wafer.

較佳地,所述複數個晶圓載盤圍繞所述蓋板設置,所述蓋板邊緣的第二凸舌沿背離蓋板中心方向延伸,所述複數個晶圓載盤上的第一凸舌沿朝向蓋板中心方向延伸;或所述蓋板圍繞所述複數個晶圓載盤設置,所述蓋板邊緣的第二凸舌沿朝向蓋板中心方向延伸,所述複數個晶圓載盤上的第一凸舌沿背離蓋板中心方向延伸。Preferably, the plurality of wafer carriers are disposed around the cover plate, and the second tab of the edge of the cover plate extends away from the center of the cover plate, and the first tongue edge of the plurality of wafer carriers Extending toward a center of the cover plate; or the cover plate is disposed around the plurality of wafer carriers, the second tab of the edge of the cover plate extends toward a center of the cover plate, and the plurality of wafer carriers A tab extends away from the center of the cover.

較佳地,所述晶圓承載區具有底壁,所述底壁具有相背離的上表面與下表面,所述上表面為晶圓承載面,所述下表面呈平面、凹面、凸面或呈臺階狀。Preferably, the wafer carrying area has a bottom wall having opposite upper and lower surfaces, the upper surface being a wafer bearing surface, and the lower surface is planar, concave, convex or Stepped.

與習知技術相比,本發明的技術方案具有以下優點:1)提供一種晶圓托盤,包含承載盤以及嵌在承載盤上表面的蓋板,該承載盤上表面具有複數個向下凹陷的晶圓承載區,該晶圓承載區用於放置晶圓,每一晶圓承載區的部分側壁頂部具有伸向承載區中心的第一凸舌,該第一凸舌沿承載區的邊緣適於覆蓋晶圓的第一部分弧形外周緣,蓋板的邊緣具有第二凸舌,該第二凸舌適於覆蓋複數個晶圓的第二部分弧形外周緣,第一及第二部分弧形外周緣共同圍繞晶圓的整個外周緣;由於承載區上的第一部分弧形外周緣小於等於晶圓外周緣的一半,因而晶圓在放置時,可以滑入上述承載區,放置好後,蓋上蓋板,第一凸舌與第二凸舌位於同一高度,對晶圓整個外緣施壓,防止晶圓翹曲;此外,每一晶圓承載區的底壁、側壁以及與側壁連接的第一凸舌一體成型,底壁對晶圓進行加熱,而第一凸舌通過側壁與底壁以一體成型方式連接,一體成型的底壁、側壁與第一凸舌之間有良好的熱傳導性能,因而三者溫度相同,使得在對晶圓托盤掃描過程中,第一凸舌不會因為溫度不同而干擾掃描結果。第三,由於蓋板嵌在承載盤內,兩者互補區域不是位於承載盤中心,加之第一凸舌與第二凸舌互補,兩者也不位於承載盤中心,因而蓋板與承載盤適於一體旋轉,上述旋轉帶動兩者之間的晶圓一起旋轉,高速旋轉的晶圓托盤能使得反應氣體在晶圓表面混合均勻,且在晶圓表面形成平流層,有助於提高沉積成膜的均勻性。Compared with the prior art, the technical solution of the present invention has the following advantages: 1) providing a wafer tray comprising a carrier tray and a cover plate embedded on the upper surface of the carrier tray, the upper surface of the carrier tray having a plurality of downward recesses a wafer carrying area for placing a wafer, and a portion of the sidewall of each of the wafer carrying areas has a first tab extending toward a center of the carrying area, the first tab being adapted to be along an edge of the carrying area Covering a curved outer periphery of the first portion of the wafer, the edge of the cover has a second tab, the second tab is adapted to cover a second outer portion of the curved outer periphery of the plurality of wafers, the first and second portions are curved The outer periphery collectively surrounds the entire outer periphery of the wafer; since the curved outer periphery of the first portion on the carrying area is less than or equal to half of the outer periphery of the wafer, the wafer can be slid into the carrying area when placed, and placed after the cover is placed The upper cover, the first tongue and the second tongue are at the same height, pressing the entire outer edge of the wafer to prevent warpage of the wafer; further, the bottom wall, the side wall and the side wall of each wafer bearing area are connected The first tongue is integrally formed, the bottom The wall heats the wafer, and the first tab is integrally formed with the bottom wall through the side wall, and the integrally formed bottom wall, the side wall and the first tongue have good heat conduction performance, so that the three temperatures are the same, so that the temperature is the same During the scanning of the wafer tray, the first tab does not interfere with the scanning result due to temperature differences. Third, since the cover plate is embedded in the carrier tray, the complementary regions of the two are not located at the center of the carrier tray, and the first tab is complementary to the second tab, and the two are not located at the center of the carrier tray, so the cover plate and the carrier tray are suitable. In one rotation, the rotation rotates the wafers between the two, and the high-speed rotating wafer tray can make the reaction gas uniformly mixed on the surface of the wafer, and form a stratosphere on the surface of the wafer, which helps to improve deposition film formation. Uniformity.

2)可選方案中,a)蓋板為一塊,蓋板上的第二凸舌與承載盤上的第一凸舌互補,即兩者形成一個首尾閉合的環形,可以覆蓋晶圓的整個外周緣,對晶圓整個外緣施壓;b)蓋板由多塊拼接而成,多塊蓋板上的第二凸舌共同與承載盤上的第一凸舌互補,即每個蓋板上的第二凸舌拼接起來,與第一凸舌形成一個首尾閉合的環形,以對晶圓的整個外周緣施壓。本方案提供了兩種蓋板的方案。2) In the alternative, a) the cover plate is a piece, and the second tongue on the cover plate is complementary to the first tongue on the carrier plate, that is, the two form an end-to-end closed ring, which can cover the entire periphery of the wafer The edge is pressed against the entire outer edge of the wafer; b) the cover plate is formed by splicing a plurality of pieces, and the second tongues on the plurality of cover plates are collectively complementary to the first tongue on the carrier plate, that is, on each cover plate The second tabs are joined together to form an end-to-end closed loop with the first tab to apply pressure to the entire outer periphery of the wafer. This solution provides two solutions for the cover.

3)可選方案中,a)蓋板嵌在承載盤的中心區域,複數個晶圓承載區圍繞蓋板設置,此種情況下,蓋板邊緣的第二凸舌沿背離承載盤中心方向延伸,晶圓承載區上的第一凸舌沿朝向承載盤中心方向延伸;b)蓋板圍繞複數個晶圓承載區設置,嵌在所述承載盤的邊緣區域,此種情況下,蓋板邊緣的第二凸舌沿朝向承載盤中心方向延伸,晶圓承載區上的第一凸舌沿背離承載盤中心方向延伸。本方案提供了兩種蓋板與晶圓承載區的位置關係,並提供了每種位置關係中,第一凸舌與第二凸舌對應的延伸方向。3) In the alternative, a) the cover plate is embedded in the central area of the carrier tray, and the plurality of wafer bearing areas are disposed around the cover plate. In this case, the second tab of the edge of the cover plate extends away from the center of the carrier tray. a first tab on the wafer carrying area extending in a direction toward the center of the carrier; b) a cover disposed around the plurality of wafer carrying areas, embedded in an edge region of the carrier, in which case the edge of the cover The second tab extends toward the center of the carrier, and the first tab on the wafer carrying area extends away from the center of the carrier. The solution provides the positional relationship between the two types of cover plates and the wafer carrying area, and provides the extending direction of the first tab and the second tongue in each positional relationship.

4)可選方案中,a)承載盤上表面具有複數個凹槽,每一凹槽形成一晶圓承載區,由於晶圓承載區是通過在承載盤上表面開槽設計,因而蓋板不論與承載盤固定還是不固定,兩者都可以一體旋轉。對於不固定的情況,由於蓋板嵌在承載盤上表面,兩者互補區域不是位於承載盤中心,加之第一凸舌與第二凸舌互補,兩者也不位於承載盤中心,因而不論承載盤旋轉帶動蓋板旋轉,還是後者帶動前者旋轉,兩者都具有卡及關係,能一體旋轉。b)晶圓托盤還包含複數個晶圓載盤,晶圓載盤位於承載盤的上表面,每一晶圓載盤形成一晶圓承載區,此種情況下,蓋板與承載盤固定;與a)方案不同的是,本方案中晶圓承載區是通過額外設置的晶圓載盤上的凹槽形成的,此種情況下,承載盤與蓋板要一體旋轉,兩者需固定,上述固定並能將晶圓載盤夾設在兩者之間,隨兩者旋轉也不會移位。4) In the alternative, a) the upper surface of the carrier has a plurality of grooves, each groove forming a wafer carrying area, and since the wafer carrying area is designed by slotting the upper surface of the carrier, the cover Whether it is fixed or not fixed to the carrier, both can be rotated integrally. In the case of non-fixation, since the cover plate is embedded on the upper surface of the carrier tray, the complementary regions of the two are not located at the center of the carrier, and the first tab is complementary to the second tab, and neither is located at the center of the carrier, so The rotation of the disc drives the cover to rotate, or the latter drives the former to rotate, both of which have a card and relationship, and can rotate integrally. b) the wafer tray further comprises a plurality of wafer carriers, the wafer carriers are located on the upper surface of the carrier tray, and each wafer carrier forms a wafer carrying area, in which case the cover plate is fixed to the carrier tray; and a) The solution is different. In this solution, the wafer carrying area is formed by the groove on the additional wafer carrier. In this case, the carrier and the cover should be rotated integrally, and the two need to be fixed. The wafer carrier is sandwiched between the two, and will not shift as the two rotate.

本發明還提供了另一種晶圓托盤,與習知技術相比,本發明的另一種晶圓托盤具有以下優點:提供一種晶圓托盤,包含相互固定的複數個晶圓載盤以及蓋板,每一晶圓載盤具有一向下凹陷的晶圓承載區,該晶圓承載區用於放置晶圓,每一晶圓承載區的部分側壁頂部具有伸向承載區中心的第一凸舌,該第一凸舌沿承載區的邊緣適於覆蓋晶圓的第一部分弧形外周緣,蓋板的邊緣具有第二凸舌,該第二凸舌適於覆蓋複數個晶圓的第二部分弧形外周緣,第一及第二部分弧形外周緣共同圍繞晶圓的整個外周緣;由於承載區上的第一部分弧形外周緣小於等於晶圓外周緣的一半,因而晶圓在放置時,可以滑入上述承載區,放置好後,固定上蓋板,第一凸舌與第二凸舌位於同一高度,對晶圓整個外緣施壓,防止晶圓翹曲;此外,每一晶圓承載區的底壁、側壁以及與側壁連接的第一凸舌一體成型,底壁對晶圓提供溫度,而第一凸舌通過側壁與底壁以一體成型方式連接,因而兩者溫度相同,使得在對晶圓托盤掃描過程中,第一凸舌不會因為溫度不同而干擾掃描結果。第三,本方案中,由於每個晶圓載盤是固定在蓋板上,因而該晶圓載盤可以更換,研究表明,在同一加熱器的加熱下,晶圓承載區的底壁的下表面具有不同形貌,例如平面、凹面、凸面或呈臺階狀時,其上承載的晶圓的溫度不同,這樣,在加熱過程中,可以根據晶圓受熱調整需要更換具有不同形貌下表面的晶圓載盤。The present invention also provides another wafer tray. Compared with the prior art, another wafer tray of the present invention has the following advantages: providing a wafer tray comprising a plurality of wafer carriers and a cover plate fixed to each other, each A wafer carrier has a downwardly recessed wafer carrying area for placing a wafer, and a portion of the sidewall of each of the wafer carrying areas has a first tab extending toward a center of the carrying area, the first The tab is adapted to cover the first portion of the curved outer periphery of the wafer along the edge of the carrying area, the edge of the cover has a second tab, and the second tab is adapted to cover the second outer peripheral edge of the plurality of wafers The first and second portions of the curved outer periphery collectively surround the entire outer periphery of the wafer; since the first portion of the curved outer periphery of the carrying portion is less than or equal to half of the outer periphery of the wafer, the wafer can be slid into the wafer when placed After the loading zone is placed, the upper cover is fixed, and the first tongue and the second tongue are at the same height, and the entire outer edge of the wafer is pressed to prevent wafer warpage; further, each wafer bearing area Bottom wall, side wall, and The first tab of the wall connection is integrally formed, the bottom wall provides temperature to the wafer, and the first tab is integrally formed by the side wall and the bottom wall, so that the two temperatures are the same, so that during the scanning of the wafer tray, The first tab does not interfere with the scan result due to temperature differences. Third, in this solution, since each wafer carrier is fixed on the cover plate, the wafer carrier can be replaced. Research shows that under the heating of the same heater, the lower surface of the bottom wall of the wafer carrying area has When different topography, such as plane, concave, convex or stepped, the temperature of the wafers carried on them is different, so that during the heating process, the wafers with different topography can be replaced according to the heating adjustment of the wafer. plate.

如先前技術中所述,現有的晶圓托盤上承載的晶圓具有複數個,該複數個晶圓在受熱過程中,容易出現翹曲。另外,如何通過掃描晶圓托盤,以精確獲得其上的晶圓的溫度也是本領域技術難題之一。針對上述問題,本發明提供一種新的晶圓托盤,包含承載盤以及嵌在承載盤上表面的蓋板,該承載盤上表面具有複數個向下凹陷的晶圓承載區,該晶圓承載區用於放置晶圓,每一晶圓承載區的部分側壁頂部具有伸向承載區中心的第一凸舌,該第一凸舌沿承載區的邊緣適於覆蓋晶圓的第一部分弧形外周緣,蓋板的邊緣具有第二凸舌,該第二凸舌適於覆蓋複數個晶圓的第二部分弧形外周緣,第一及第二部分弧形外周緣共同圍繞晶圓的整個外周緣;由於承載區上的第一部分弧形外周緣小於等於晶圓外周緣的一半,因而晶圓在放置時,可以滑入上述承載區,放置好後,蓋上蓋板,第一凸舌與第二凸舌位於同一高度,對晶圓整個外緣施壓,防止晶圓翹曲;此外,每一晶圓承載區的底壁、側壁以及與側壁連接的第一凸舌一體成型,底壁對晶圓提供溫度,而第一凸舌通過側壁與底壁以一體成型方式連接,因而兩者溫度相同,使得在對晶圓托盤掃描過程中,第一凸舌不會因為溫度不同而干擾掃描結果。再者,由於蓋板嵌在承載盤內,兩者互補區域不是位於承載盤中心,加之第一凸舌與第二凸舌互補,兩者也不位於承載盤中心,因而蓋板與承載盤適於一體旋轉,上述旋轉帶動兩者之間的晶圓一起旋轉,高速旋轉的晶圓托盤能使得反應氣體在晶圓表面混合均勻,且在晶圓表面形成平流層,有助於提高沉積成膜的均勻性。As described in the prior art, there are a plurality of wafers carried on an existing wafer tray, and the plurality of wafers are prone to warpage during heating. In addition, how to accurately obtain the temperature of the wafer on the wafer tray by scanning the wafer tray is also one of the technical problems in the art. In view of the above problems, the present invention provides a new wafer tray comprising a carrier disk and a cover plate embedded on the upper surface of the carrier disk, the upper surface of the carrier disk having a plurality of downwardly recessed wafer bearing areas, the wafer bearing area For placing a wafer, a portion of the sidewall of each of the wafer carrying regions has a first tab extending toward the center of the carrying region, the first tab being adapted to cover the first portion of the curved outer periphery of the wafer along the edge of the carrying region The edge of the cover has a second tab adapted to cover the second outer peripheral edge of the plurality of wafers, and the first and second portions of the curved outer periphery collectively surround the entire periphery of the wafer Since the curved outer periphery of the first portion of the carrying area is less than or equal to half of the outer periphery of the wafer, the wafer can be slid into the carrying area when placed, and after being placed, the cover is closed, the first tongue and the first The two tabs are at the same height, and pressurize the entire outer edge of the wafer to prevent warpage of the wafer; in addition, the bottom wall, the side wall of each wafer carrying area, and the first tab connected to the side wall are integrally formed, and the bottom wall pair Wafer provides temperature, and first Tongue and through the side wall is integrally formed in the bottom wall are connected, so both have the same temperature, so that the scanning process in the wafer tray, a first temperature tabs that would not interfere with the scan results pair. Furthermore, since the cover plate is embedded in the carrier tray, the complementary regions of the two are not located at the center of the carrier tray, and the first tab is complementary to the second tab, and neither is located at the center of the carrier tray, so the cover plate and the carrier tray are suitable. In one rotation, the rotation rotates the wafers between the two, and the high-speed rotating wafer tray can make the reaction gas uniformly mixed on the surface of the wafer, and form a stratosphere on the surface of the wafer, which helps to improve deposition film formation. Uniformity.

為使本發明的上述目的、特徵及優點能夠更為淺顯易懂,下面結合附圖對本發明的具體實施例做詳細的說明。The above described objects, features and advantages of the present invention will become more apparent from the aspects of the appended claims.

第1圖是本發明一實施例提供的晶圓托盤的分解結構示意圖。第2圖是第1圖中的晶圓托盤在裝配完畢後的部分結構的剖視圖。第3圖是晶圓3裝配在第1圖中的晶圓托盤過程中的結構示意圖。第4圖是第3圖中的部分結構在裝配完畢後的剖視圖。參照第1圖與第4圖所示,該晶圓托盤包含:FIG. 1 is a schematic exploded view of a wafer tray according to an embodiment of the present invention. Fig. 2 is a cross-sectional view showing a part of the structure of the wafer tray in Fig. 1 after assembly. Fig. 3 is a schematic view showing the structure of the wafer 3 assembled in the wafer tray in Fig. 1. Figure 4 is a cross-sectional view of the portion of the structure in Figure 3 after assembly. Referring to Figures 1 and 4, the wafer tray contains:

承載盤1,上表面具有複數個向下凹陷的晶圓承載區10,晶圓承載區10用於放置晶圓3,每一晶圓承載區10的部分側壁頂部具有伸向承載區10中心的第一凸舌11,每一晶圓承載區10的底壁、側壁以及與側壁連接的第一凸舌11一體成型,其中第一凸舌11沿承載區10的邊緣適於覆蓋晶圓3的第一部分弧形外周緣,該第一部分弧形外周緣小於等於晶圓3外周緣的一半;The carrier disk 1 has a plurality of downwardly recessed wafer carrying regions 10 on the upper surface thereof, and the wafer carrying region 10 is used for placing the wafers 3, and a portion of the sidewalls of each of the wafer carrying regions 10 has a top portion extending toward the center of the carrying region 10. a first tab 11 , a bottom wall of each of the wafer carrying areas 10 , a sidewall and a first tab 11 connected to the sidewall, wherein the first tab 11 is adapted to cover the wafer 3 along the edge of the carrying region 10 a first portion of the curved outer periphery, the first portion of the curved outer periphery being less than or equal to half of the outer periphery of the wafer 3;

蓋板2,嵌在承載盤1的上表面,蓋板2的邊緣具有第二凸舌21,第二凸舌21適於覆蓋複數個晶圓3的第二部分弧形外周緣,所述第一及第二部分弧形外周緣共同圍繞晶圓3的整個外周緣。The cover plate 2 is embedded on the upper surface of the carrier tray 1. The edge of the cover plate 2 has a second tab 21, and the second tab 21 is adapted to cover a second portion of the curved outer periphery of the plurality of wafers 3, The first and second portions of the curved outer periphery collectively surround the entire outer periphery of the wafer 3.

以下分別介紹各部件。The components are described separately below.

參照第1圖與第2圖所示,本實施例中的承載盤1上表面具有複數個凹槽,每一凹槽形成一晶圓承載區10,該晶圓承載區10具有5個。其他實施例中,形成在一承載盤1上的晶圓承載區10也可以具有其他數目。Referring to FIG. 1 and FIG. 2, the upper surface of the carrier 1 in this embodiment has a plurality of grooves, each of which forms a wafer carrying area 10 having five wafer carrying areas 10. In other embodiments, the wafer carrier area 10 formed on a carrier 1 may have other numbers.

仍參照第1圖與第2圖所示,由於晶圓3需滑入上述承載區10,因而第一凸舌11所覆蓋的第一部分弧形外周緣需小於等於晶圓3外周緣的一半。Still referring to FIGS. 1 and 2, since the wafer 3 needs to slide into the carrying area 10, the first peripheral curved outer periphery of the first tab 11 needs to be less than or equal to half of the outer periphery of the wafer 3.

此外,每一晶圓承載區10的底壁、側壁以及與側壁連接的第一凸舌11一體成型,這是因為:在對晶圓3處理過程中,由承載區10的底壁對晶圓3加熱,本實施例中,上述底壁由承載盤1充當,在上方對晶圓托盤掃描過程中,第一凸舌11若與底壁溫度不同,則會干擾掃描結果。In addition, the bottom wall, the sidewall of each wafer carrying area 10, and the first tab 11 connected to the sidewall are integrally formed because the bottom wall of the carrying area 10 is wafer-to-wafer during processing of the wafer 3. 3 Heating, in the present embodiment, the bottom wall is served by the carrier disk 1. During the scanning of the wafer tray above, the first tongue 11 may interfere with the scanning result if the temperature is different from the bottom wall.

承載盤1的材質可以為石墨。The material of the carrier plate 1 may be graphite.

參照第1圖至第4圖所示,可以看出,蓋板2嵌在承載盤1的中心區域,5個晶圓承載區10圍繞蓋板2設置,因而,蓋板2邊緣的第二凸舌21沿背離承載盤1中心方向延伸,晶圓承載區10上的第一凸舌11沿朝向承載盤1中心方向延伸。其他實施例中,蓋板2也可以圍繞複數個晶圓承載區10設置,蓋板2嵌在承載盤1的邊緣區域,此種情況下,蓋板2邊緣的第二凸舌21沿朝向承載盤1中心方向延伸,晶圓承載區10上的第一凸舌11沿背離承載盤1中心方向延伸。Referring to FIGS. 1 to 4, it can be seen that the cover 2 is embedded in the central area of the carrier 1 and the five wafer carrying areas 10 are disposed around the cover 2, thus the second convex of the edge of the cover 2. The tongue 21 extends away from the center of the carrier tray 1, and the first tab 11 on the wafer carrying area 10 extends in the direction toward the center of the carrier tray 1. In other embodiments, the cover plate 2 can also be disposed around a plurality of wafer carrying areas 10, and the cover plate 2 is embedded in the edge region of the carrier tray 1. In this case, the second tab 21 at the edge of the cover plate 2 is oriented along the bearing. The disk 1 extends in the center direction, and the first tab 11 on the wafer carrying area 10 extends in a direction away from the center of the carrier disk 1.

參照第1圖與第3圖所示,本實施例中,蓋板2為一塊,蓋板2上的第二凸舌21與承載盤1上的第一凸舌11互補,即兩者形成一個首尾閉合的環形,可以覆蓋晶圓3的整個外周緣,對晶圓3整個外緣施壓。其他實施例中,蓋板2也可以由多塊拼接而成,多塊蓋板2上的第二凸舌21共同與承載盤1上的第一凸舌11互補,即每個蓋板2上的第二凸舌21拼接起來,與第一凸舌11形成一個首尾閉合的環形,以對晶圓3的整個外周緣施壓。Referring to Figures 1 and 3, in the present embodiment, the cover plate 2 is a piece, and the second tab 21 on the cover plate 2 is complementary to the first tab 11 on the carrier tray 1, that is, the two form a The end-to-end closed ring can cover the entire outer periphery of the wafer 3 and press the entire outer edge of the wafer 3. In other embodiments, the cover plate 2 may also be formed by splicing a plurality of pieces, and the second tongues 21 on the plurality of cover plates 2 are commonly complementary to the first tongues 11 on the carrier disk 1, that is, on each of the cover plates 2 The second tabs 21 are joined together to form an end-to-end closed loop with the first tabs 11 to press the entire outer periphery of the wafer 3.

在對晶圓3處理過程中,蓋板2與承載盤1適於一體旋轉。本實施例中,由於晶圓承載區10是通過在承載盤1上表面開槽設計,因而承載盤1與蓋板2即使不固定也能實現一體旋轉。這是因為,由於蓋板2嵌在承載盤1上表面,兩者互補區域不是位於承載盤1中心,加之第一凸舌11與第二凸舌21互補,兩者都具有卡及關係,能一體旋轉。During processing of the wafer 3, the cover 2 and the carrier 1 are adapted to rotate integrally. In this embodiment, since the wafer carrying area 10 is designed to be grooved on the upper surface of the carrier disk 1, the carrier disk 1 and the cover plate 2 can be integrally rotated even if they are not fixed. This is because, since the cover plate 2 is embedded on the upper surface of the carrier tray 1, the complementary regions of the two are not located at the center of the carrier tray 1, and the first tab 11 and the second tab 21 are complementary, both of which have a card relationship. One rotation.

蓋板2與承載盤1的一體旋轉可以通過下述兩種方式實現:a)轉軸(未圖示)連接在承載盤1的中心,承載盤1帶動蓋板2旋轉,此過程中,晶圓承載區10內的晶圓3也被帶動旋轉;或b)轉軸連接在蓋板2的中心,蓋板2帶動承載盤1旋轉,此時,承載盤1具有適於轉軸通過的孔,上述過程中,晶圓承載區10內的晶圓3也被帶動旋轉。The integral rotation of the cover plate 2 and the carrier tray 1 can be achieved in two ways: a) a rotating shaft (not shown) is connected to the center of the carrier tray 1, and the carrier tray 1 drives the cover plate 2 to rotate, in the process, the wafer The wafer 3 in the bearing area 10 is also rotated; or b) the rotating shaft is connected to the center of the cover 2, and the cover 2 drives the carrier 1 to rotate. At this time, the carrier 1 has a hole suitable for the shaft to pass through, the above process The wafer 3 in the wafer carrying area 10 is also rotated.

在具體實施過程中,轉軸可以呈方形或三角形(橫截面),對於a)方案,承載盤1的中心相應地具有方形或三角形槽;對於b)方案,蓋板2的中心相應地具有方形或三角形槽。優選地,對於a)方案,如第1圖所示,承載盤1的中心還具有擋塊12,上述擋塊12用於轉軸抵靠,此種情況下,蓋板2上具有與擋塊12匹配的鏤空區域22。In a specific implementation, the rotating shaft may have a square shape or a triangular shape (cross section). For the a) solution, the center of the carrier disk 1 has a square or triangular groove correspondingly; for the b) solution, the center of the cover plate 2 has a square shape or Triangle slot. Preferably, for the a) solution, as shown in FIG. 1, the center of the carrier tray 1 further has a stopper 12 for the shaft to abut. In this case, the cover plate 2 has a stopper 12 thereon. Matching hollowed out area 22.

參照第1圖與第2圖所示,晶圓承載區10的底壁具有相背離的上表面與下表面,上表面為承載面,該下表面可以為平面、凹面、凸面或呈臺階狀,研究表明,在同一加熱器的加熱下,具有不同形貌的下表面,例如平面、凹面、凸面或呈臺階狀時,其上承載的晶圓3的溫度不同,因而可以根據晶圓3受熱調整需要選擇不同形貌的承載區下表面。對於凹面、凸面,還可以為不同曲度的凹面、凸面,對於臺階狀,還可以為不同步長、不同臺階高度差的臺階狀。Referring to FIGS. 1 and 2, the bottom wall of the wafer carrying area 10 has opposing upper and lower surfaces, and the upper surface is a bearing surface, which may be planar, concave, convex or stepped. Studies have shown that under the heating of the same heater, when the lower surface with different morphologies, such as plane, concave, convex or stepped, the temperature of the wafer 3 carried thereon is different, and thus can be adjusted according to the heat of the wafer 3. It is necessary to select the lower surface of the load-bearing area with different topography. For the concave surface and the convex surface, the concave surface and the convex surface having different curvatures may be used. For the step shape, the stepped shape may be a long difference in height and a difference in step height.

第5圖是本發明另一實施例中的晶圓托盤在與晶圓3裝配過程中的結構示意圖。第6圖是第5圖中的部分結構在裝配完畢後的剖視圖。參照第5圖與第6圖所示,蓋板2與承載盤1也可以通過固定裝置4,實現兩者固定。上述固定裝置4可以為螺釘,也可以為其他類型的固定裝置。上述固定裝置4可以從下往上依次穿過承載盤1與蓋板2,以實現兩者之間的固定,也可以從上往下依次穿過蓋板2與承載盤1,以實現兩者之間的固定。前者情況中,若固定裝置為螺釘,螺釘的頭部可以不透出蓋板2的表面。Fig. 5 is a structural schematic view showing the wafer tray in the process of assembling with the wafer 3 in another embodiment of the present invention. Figure 6 is a cross-sectional view of the portion of the structure in Figure 5 after assembly. Referring to Figures 5 and 6, the cover 2 and the carrier 1 can also be secured by the fixture 4. The fixing device 4 described above may be a screw or other type of fixing device. The fixing device 4 can pass through the carrier 1 and the cover 2 in order from bottom to top to achieve the fixation between the two, and can also pass through the cover 2 and the carrier 1 in order from the top to the bottom to realize the two. Fixed between. In the former case, if the fixing device is a screw, the head of the screw may not penetrate the surface of the cover 2.

本發明再一實施例中還提供了一種晶圓托盤,上述晶圓托盤與第1圖至第6圖中的晶圓托盤大致相同,區別在於:晶圓承載區10是通過額外設置的晶圓載盤上的凹槽形成的。相應地,該晶圓托盤除了包含蓋板2與承載盤1,還包含複數個個晶圓載盤。本實施例中,蓋板2與承載盤1固定,上述固定例如通過螺釘實現。兩者固定並能將晶圓載盤夾設在蓋板2與承載盤1之間,隨兩者旋轉也不會移位。此種情況下,晶圓載盤可以固定,也可以不固定在承載盤1上。In another embodiment of the present invention, a wafer tray is provided, and the wafer tray is substantially the same as the wafer trays in FIGS. 1 to 6 except that the wafer carrying area 10 is loaded by an additional wafer. The groove on the disc is formed. Correspondingly, the wafer tray comprises a plurality of wafer carriers in addition to the cover plate 2 and the carrier tray 1. In this embodiment, the cover 2 is fixed to the carrier 1 and the above fixing is achieved, for example, by screws. The two are fixed and can sandwich the wafer carrier between the cover 2 and the carrier 1 and will not be displaced as the two rotate. In this case, the wafer carrier may or may not be fixed to the carrier 1.

本實施例中,蓋板2以及承載盤1的一體旋轉可以通過下述兩種方案實現:a)轉軸連接在承載盤1的中心,承載盤1帶動複數個晶圓載盤以及蓋板2旋轉;或b)轉軸連接在蓋板2的中心,蓋板2帶動複數個晶圓載盤以及承載盤1旋轉,此種情況下,承載盤1具有適於轉軸通過的孔。In this embodiment, the integral rotation of the cover 2 and the carrier 1 can be achieved by the following two schemes: a) the rotating shaft is connected to the center of the carrier 1 , and the carrier 1 drives the plurality of wafer carriers and the cover 2 to rotate; Or b) the rotating shaft is connected at the center of the cover plate 2, the cover plate 2 drives a plurality of wafer carriers and the carrier disk 1 rotates. In this case, the carrier disk 1 has a hole suitable for the passage of the rotating shaft.

在具體實施過程中,轉軸可以呈方形或三角形(橫截面),對於a)方案,承載盤1的中心相應地具有方形或三角形槽;對於b)方案,蓋板2的中心相應地具有方形或三角形槽。優選地,對於a)方案,承載盤1的中心還具有擋塊,該擋塊用於轉軸抵靠,蓋板2上具有與擋塊匹配的鏤空區域。In a specific implementation, the rotating shaft may have a square shape or a triangular shape (cross section). For the a) solution, the center of the carrier disk 1 has a square or triangular groove correspondingly; for the b) solution, the center of the cover plate 2 has a square shape or Triangle slot. Preferably, for the a) solution, the center of the carrier tray 1 also has a stop for the shaft to abut, and the cover 2 has a hollowed area that matches the stop.

本發明又一實施例還提供一種晶圓托盤,上述晶圓托盤前述實施例中的晶圓托盤相比,區別在於:無承載盤1,而是將複數個晶圓載盤固定在蓋板2上。上述固定例如通過螺釘實現。每一晶圓載盤具有一向下凹陷的晶圓承載區10,即晶圓承載區10由晶圓載盤上的凹槽提供。A further embodiment of the present invention further provides a wafer tray, wherein the wafer tray is different from the wafer tray in the foregoing embodiment in that: the carrier tray 1 is not provided, but the plurality of wafer carriers are fixed on the cover 2 . The above fixing is achieved, for example, by screws. Each wafer carrier has a downwardly recessed wafer carrier region 10, i.e., wafer carrier region 10 is provided by a recess in the wafer carrier.

本實施例的好處在於:由於每個晶圓載盤是固定在蓋板1上,因而該晶圓載盤可以更換,這樣在加熱過程中,可以根據晶圓3受熱調整需要更換具有不同形貌承載區下表面,例如下表面呈平面、凹面、凸面或呈臺階狀的晶圓載盤。The advantage of this embodiment is that since each wafer carrier is fixed on the cover plate 1, the wafer carrier can be replaced, so that during the heating process, the carrier having different shapes can be replaced according to the heat adjustment of the wafer 3. The lower surface, for example, the lower surface is a flat, concave, convex or stepped wafer carrier.

具體地,該晶圓載盤可以具有兩個對稱的耳部,螺釘固定在耳部上。其他實施例中,螺釘也可以穿過該晶圓載盤的邊緣區域。In particular, the wafer carrier can have two symmetrical ears with screws fixed to the ears. In other embodiments, the screw can also pass through the edge region of the wafer carrier.

在具體實施過程中,螺釘優選從下往上依次穿過晶圓載盤與蓋板2,以實現兩者之間的固定,如此,在更換晶圓載盤時,向下旋下螺釘,即可進行新的晶圓載盤更換,使得更換過程中,不污染其他晶圓載盤上所承載的晶圓3。此外,上述自下而上的固定方式還可以使得螺釘的頭部不透出蓋板2的表面,實現蓋板2上表面的整潔。其他實施例中,螺釘也可以從上往下依次穿過蓋板2與晶圓載盤以實現兩者固定。In a specific implementation process, the screws preferably pass through the wafer carrier and the cover 2 in order from bottom to top to achieve the fixation therebetween, so that when the wafer carrier is replaced, the screw can be screwed down. The new wafer carrier is replaced so that the wafers carried on other wafer carriers are not contaminated during the replacement process. In addition, the above-mentioned bottom-up fixing manner can also make the head of the screw not penetrate the surface of the cover plate 2, and the upper surface of the cover plate 2 can be cleaned. In other embodiments, the screws may also pass through the cover 2 and the wafer carrier in order from top to bottom to achieve both.

螺釘4的材質可以為石墨或鎢。The material of the screw 4 may be graphite or tungsten.

可以看出,不論晶圓承載區10由承載盤1上的凹槽提供,還是由晶圓載盤上的凹槽提供,不論有無承載盤1,承載區10的部分側壁頂部伸向承載區中心的第一凸舌11與蓋板2的邊緣的第二凸舌21互補,兩者位於同一高度且共同圍繞晶圓3的整個外周緣,即可對晶圓3的整個外周緣施壓,避免晶圓3的加工過程中翹曲。另外,每一晶圓承載區10的底壁、側壁以及與側壁連接的第一凸舌11一體成型,即能防止在對晶圓托盤掃描過程中,第一凸舌11不會因為與底壁溫度不同而干擾掃描結果。It can be seen that whether the wafer carrying area 10 is provided by the groove on the carrier disk 1 or by the groove on the wafer carrier, with or without the carrier disk 1, the top part of the side wall of the carrying area 10 extends toward the center of the carrying area. The first tab 11 is complementary to the second tab 21 of the edge of the cover 2, and both are at the same height and collectively surround the entire outer periphery of the wafer 3, so that the entire outer periphery of the wafer 3 can be pressed to avoid crystals. Warp during the processing of the circle 3. In addition, the bottom wall, the sidewall of each wafer carrying area 10, and the first tab 11 connected to the sidewall are integrally formed, that is, the first tab 11 is prevented from being in the bottom wall during scanning of the wafer tray. The temperature is different and interferes with the scan results.

雖然本發明披露如上,但本發明並非限定於此。任何本領域技術人員,在不脫離本發明的精神及範圍內,均可作各種更動與修改,因此本發明的保護範圍應當以權利要求所限定的範圍為准。Although the present invention has been disclosed above, the present invention is not limited thereto. Any changes and modifications may be made by those skilled in the art without departing from the spirit and scope of the invention, and the scope of the invention should be determined by the scope defined by the appended claims.

1‧‧‧承載盤
10‧‧‧晶圓承載區
11‧‧‧第一凸舌
12‧‧‧擋塊
2‧‧‧蓋板
21‧‧‧第二凸舌
22‧‧‧鏤空區域
3‧‧‧晶圓
4‧‧‧固定裝置
1‧‧‧ Carrying tray
10‧‧‧ wafer bearing area
11‧‧‧First tongue
12‧‧ ‧stop
2‧‧‧ Cover
21‧‧‧second tongue
22‧‧‧ hollow area
3‧‧‧ wafer
4‧‧‧Fixed devices

第1圖是本發明一實施例中的晶圓托盤的分解結構示意圖;1 is a schematic exploded view of a wafer tray in an embodiment of the present invention;

第2圖是第1圖中的晶圓托盤在裝配完畢後的部分結構的剖視圖;Figure 2 is a cross-sectional view showing a portion of the structure of the wafer tray in Fig. 1 after assembly;

第3圖是晶圓裝配在第1圖中的晶圓托盤過程中的結構示意圖;Figure 3 is a schematic view showing the structure of the wafer assembly in the wafer tray process of Figure 1;

第4圖是第3圖中的部分結構在裝配完畢後的剖視圖;Figure 4 is a cross-sectional view of the portion of the structure in Figure 3 after assembly;

第5圖是本發明另一實施例中的晶圓托盤在與晶圓裝配過程中的結構示意圖;以及5 is a schematic structural view of a wafer tray in a process of assembling with a wafer in another embodiment of the present invention;

第6圖是第5圖中的部分結構在裝配完畢後的剖視圖。Figure 6 is a cross-sectional view of the portion of the structure in Figure 5 after assembly.

1‧‧‧承載盤 1‧‧‧ Carrying tray

10‧‧‧晶圓承載區 10‧‧‧ wafer bearing area

11‧‧‧第一凸舌 11‧‧‧First tongue

12‧‧‧擋塊 12‧‧ ‧stop

2‧‧‧蓋板 2‧‧‧ Cover

21‧‧‧第二凸舌 21‧‧‧second tongue

22‧‧‧鏤空區域 22‧‧‧ hollow area

Claims (18)

一種晶圓托盤,其包含: 一承載盤,其上表面具有向下凹陷的複數個晶圓承載區,該複數個晶圓承載區用於放置晶圓,每一該晶圓承載區的側壁頂部之一部份具有伸向各該晶圓承載區中心的第一凸舌,每一該晶圓承載區的底壁、該側壁以及與該側壁連接的該第一凸舌一體成型,其中該第一凸舌沿各該晶圓承載區的邊緣適於覆蓋複數個晶圓的第一部分弧形外周緣,該第一部分弧形外周緣小於等於晶圓外周緣的一半;以及 一蓋板,嵌在該承載盤的該上表面,該蓋板的邊緣具有一第二凸舌,該第二凸舌適於覆蓋該複數個晶圓的第二部分弧形外周緣,該第一部分弧形外周緣及該第二部分弧形外周緣共同圍繞該複數個晶圓的整個外周緣。A wafer tray comprising: a carrier having an upper surface having a plurality of wafer carrying regions recessed downwardly, the plurality of wafer carrying regions for placing wafers, and a sidewall of each of the wafer carrying regions One portion has a first tab extending toward a center of each of the wafer carrying regions, and a bottom wall of each of the wafer carrying regions, the sidewall, and the first tab connected to the sidewall are integrally formed, wherein the first portion a tab along an edge of each of the wafer carrying regions is adapted to cover a first portion of the curved outer periphery of the plurality of wafers, the first portion of the curved outer periphery being less than or equal to half of the outer periphery of the wafer; and a cover plate embedded in The upper surface of the carrier has a second tab, the second tab is adapted to cover a second outer peripheral edge of the plurality of wafers, the first portion of the curved outer periphery and The second portion of the curved outer periphery collectively surrounds the entire outer periphery of the plurality of wafers. 如申請專利範圍第1項所述的晶圓托盤,其中該蓋板為一塊,該蓋板上的該第二凸舌與該承載盤上的該第一凸舌互補,用於覆蓋該複數個晶圓的該整個外周緣; 或該蓋板由多塊拼接而成,多塊的該蓋板上的該第二凸舌共同與該承載盤上的該第一凸舌互補,用於覆蓋該複數個晶圓的該整個外周緣。The wafer tray of claim 1, wherein the cover plate is a piece, and the second tongue on the cover plate is complementary to the first tab on the carrier plate for covering the plurality of The entire outer periphery of the wafer; or the cover plate is formed by splicing a plurality of pieces, and the plurality of second tongues on the cover plate are collectively complementary to the first tongue on the carrier plate for covering the The entire outer circumference of the plurality of wafers. 如申請專利範圍第1項所述的晶圓托盤,其中該蓋板嵌在該承載盤的中心區域,該複數個晶圓承載區圍繞該蓋板設置,該蓋板邊緣的該第二凸舌沿背離該承載盤的中心方向延伸,該複數個晶圓承載區上的該第一凸舌沿朝向該承載盤的中心方向延伸; 或該蓋板圍繞該複數個晶圓承載區設置,嵌在該承載盤的邊緣區域,該蓋板邊緣的該第二凸舌沿朝向該承載盤的中心方向延伸,該晶圓承載區上的該第一凸舌沿背離該承載盤中心方向延伸。The wafer tray of claim 1, wherein the cover is embedded in a central area of the carrier, the plurality of wafer carrying areas are disposed around the cover, and the second tab of the cover edge Extending in a direction away from a center of the carrier, the first tab on the plurality of wafer carrying regions extends toward a center of the carrier; or the cover is disposed around the plurality of wafer carrying regions, embedded in the In the edge region of the carrier, the second tab of the edge of the cover extends toward a center of the carrier, and the first tab on the wafer carrying region extends away from the center of the carrier. 如申請專利範圍第1項所述的晶圓托盤,其中該承載盤上表面具有複數個凹槽,每一該凹槽形成該晶圓承載區,該蓋板與該承載盤固定或未固定。The wafer tray of claim 1, wherein the upper surface of the carrier has a plurality of grooves, each of the grooves forming the wafer carrying area, the cover being fixed or unsecured with the carrier. 如申請專利範圍第1項所述的晶圓托盤,其中還包含複數個晶圓載盤,該複數個晶圓載盤位於該承載盤的上表面,每一該晶圓載盤形成該晶圓承載區,該蓋板與該承載盤固定。The wafer tray of claim 1, further comprising a plurality of wafer carriers, the plurality of wafer carriers being located on an upper surface of the carrier, each of the wafer carriers forming the wafer carrying area The cover plate is fixed to the carrier tray. 如申請專利範圍第5項所述的晶圓托盤,其中該複數個晶圓載盤固定或未固定在該承載盤的上表面。The wafer tray of claim 5, wherein the plurality of wafer carriers are fixed or not fixed to an upper surface of the carrier. 如申請專利範圍第5項所述的晶圓托盤,其中該蓋板通過一螺釘固定在該承載盤的上表面。The wafer tray of claim 5, wherein the cover is fixed to an upper surface of the carrier by a screw. 如申請專利範圍第1項所述的晶圓托盤,其中該晶圓承載區的該底壁具有相背離的上表面與下表面,該上表面為晶圓承載面,該下表面呈平面、凹面、凸面或呈臺階狀。The wafer tray of claim 1, wherein the bottom wall of the wafer carrying area has opposite upper and lower surfaces, the upper surface being a wafer bearing surface, the lower surface being flat and concave , convex or stepped. 如申請專利範圍第4項所述的晶圓托盤,其中該蓋板以及該承載盤適於一體旋轉:a)一轉軸連接在該承載盤的中心,該承載盤帶動該蓋板旋轉;或b)該轉軸連接在該蓋板的中心,該蓋板帶動該承載盤旋轉,該承載盤具有適於該轉軸通過的孔。The wafer tray of claim 4, wherein the cover plate and the carrier tray are adapted to rotate integrally: a) a rotating shaft is coupled to the center of the carrier tray, the carrier tray drives the cover plate to rotate; or b The rotating shaft is connected to the center of the cover plate, and the cover plate drives the carrying tray to rotate. The carrying tray has a hole suitable for the passage of the rotating shaft. 如申請專利範圍第9項所述的晶圓托盤,其中該轉軸的橫截面呈方形或三角形,對於a),該承載盤的中心相應地具有方形或三角形槽;對於b),該蓋板的中心相應地具有方形或三角形槽。The wafer tray of claim 9, wherein the shaft has a square or triangular cross section, and for a), the center of the carrier has a square or triangular groove correspondingly; and b), the cover The center accordingly has a square or triangular groove. 如申請專利範圍第10項所述的晶圓托盤,其中對於a),該承載盤的中心還具有一擋塊,用於該轉軸抵靠,該蓋板上具有與該擋塊匹配的鏤空區域。The wafer tray of claim 10, wherein for the a), the center of the carrier tray further has a stopper for the shaft to abut, and the cover has a hollowed area matching the stopper . 如申請專利範圍第5項所述的晶圓托盤,其中該蓋板以及該承載盤適於一體旋轉:a)一轉軸連接在該承載盤的中心,該承載盤帶動該複數個晶圓載盤以及該蓋板旋轉;或b)該轉軸連接在該蓋板的中心,該蓋板帶動該複數個晶圓載盤以及該承載盤旋轉,該承載盤具有適於該轉軸通過的孔。The wafer tray of claim 5, wherein the cover plate and the carrier tray are adapted to rotate integrally: a) a rotating shaft is coupled to the center of the carrier tray, the carrier tray drives the plurality of wafer carriers and The cover plate is rotated; or b) the rotating shaft is coupled to the center of the cover plate, and the cover plate drives the plurality of wafer carriers and the carrier disk to rotate, the carrier disk having a hole suitable for the passage of the rotating shaft. 如申請專利範圍第12項所述的晶圓托盤,其中該轉軸的橫截面呈方形或三角形,對於a),該承載盤的中心相應地具有方形或三角形槽;對於b),該蓋板的中心相應地具有方形或三角形槽。The wafer tray of claim 12, wherein the shaft has a square or triangular cross section, and for a), the center of the carrier has a square or triangular groove correspondingly; and b), the cover The center accordingly has a square or triangular groove. 如申請專利範圍第13項所述的晶圓托盤,其中對於a),該承載盤的中心還具有擋塊,用於該轉軸抵靠,該蓋板上具有與該擋塊匹配的鏤空區域。The wafer tray of claim 13 wherein, for a), the center of the carrier tray further has a stop for the shaft to abut, the cover having a hollowed area matching the stop. 一種晶圓托盤,其包含: 複數個晶圓載盤,每一該晶圓載盤具有向下凹陷的一晶圓承載區,該晶圓承載區用於放置晶圓,每一該晶圓承載區的側壁頂部的一部分具有伸向承載區中心的第一凸舌,每一晶圓承載區的底壁、該側壁以及與該側壁連接的該第一凸舌一體成型,其中該第一凸舌沿該晶圓承載區的邊緣適於覆蓋複數個晶圓的第一部分弧形外周緣,該第一部分弧形外周緣小於等於該複數個晶圓的外周緣的一半;以及 蓋板,嵌在該複數個晶圓載盤的上表面並暴露出該複數個晶圓承載區,該蓋板與該複數個晶圓載盤固定,該蓋板的邊緣具有第二凸舌,該第二凸舌適於覆蓋該複數個晶圓的第二部分弧形外周緣,該第一部分弧形外周緣及該第二部分弧形外周緣共同圍繞該複數個晶圓的整個外周緣。A wafer tray comprising: a plurality of wafer carriers, each of the wafer carriers having a wafer carrying area recessed downwardly, the wafer carrying area for placing a wafer, each of the wafer carrying areas a portion of the top of the sidewall has a first tab extending toward the center of the carrier region, the bottom wall of each wafer carrying region, the sidewall, and the first tab connected to the sidewall being integrally formed, wherein the first tab is along the An edge of the wafer carrying region is adapted to cover a first portion of the curved outer periphery of the plurality of wafers, the first portion of the curved outer periphery being less than or equal to half of an outer circumference of the plurality of wafers; and a cover plate embedded in the plurality of An upper surface of the wafer carrier and exposing the plurality of wafer carrying regions, the cover plate being fixed to the plurality of wafer carriers, the edge of the cover having a second tab, the second tab being adapted to cover the plurality The second portion of the wafer has a curved outer periphery, and the first portion of the curved outer periphery and the second portion of the curved outer periphery collectively surround the entire outer periphery of the plurality of wafers. 如申請專利範圍第15項所述的晶圓托盤,其中該蓋板為一塊,該蓋板上的該第二凸舌與該複數個晶圓載盤上的該第一凸舌互補,用於覆蓋該複數個晶圓的整個外周緣; 或該蓋板由多塊拼接而成,多塊的該蓋板上的該第二凸舌共同與該複數個晶圓載盤上的該第一凸舌互補,用於覆蓋該複數個晶圓的整個外周緣。The wafer tray of claim 15, wherein the cover plate is a block, and the second tab on the cover plate is complementary to the first tab on the plurality of wafer carriers for covering The entire outer periphery of the plurality of wafers; or the cover plate is formed by splicing a plurality of pieces, and the plurality of second tongues on the cover plate are commonly complementary to the first tongue on the plurality of wafer carriers For covering the entire outer circumference of the plurality of wafers. 如申請專利範圍第15項所述的晶圓托盤,其中該複數個晶圓載盤圍繞該蓋板設置,該蓋板邊緣的該第二凸舌沿背離該蓋板的中心方向延伸,該複數個晶圓載盤上的該第一凸舌沿朝向該蓋板的中心方向延伸; 或該蓋板圍繞該複數個晶圓載盤設置,該蓋板邊緣的該第二凸舌沿朝向該蓋板的中心方向延伸,該複數個晶圓載盤上的該第一凸舌沿背離該蓋板的中心方向延伸。The wafer tray of claim 15, wherein the plurality of wafer carriers are disposed around the cover plate, and the second tab of the edge of the cover plate extends away from a center of the cover plate, the plurality of The first tab on the wafer carrier extends in a direction toward a center of the cover; or the cover is disposed around the plurality of wafer carriers, the second tab of the edge of the cover facing the center of the cover The direction extends, and the first tab on the plurality of wafer carriers extends in a direction away from a center of the cover. 如申請專利範圍第15項所述的晶圓托盤,其中該晶圓承載區的該底壁具有相背離的上表面與下表面,該上表面為晶圓承載面,該下表面呈平面、凹面、凸面或呈臺階狀。The wafer tray of claim 15, wherein the bottom wall of the wafer carrying area has opposite upper and lower surfaces, the upper surface being a wafer carrying surface, the lower surface being flat and concave , convex or stepped.
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