TW201618895A - Grinder and semiconductor strip grinder with the same - Google Patents

Grinder and semiconductor strip grinder with the same Download PDF

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Publication number
TW201618895A
TW201618895A TW104128604A TW104128604A TW201618895A TW 201618895 A TW201618895 A TW 201618895A TW 104128604 A TW104128604 A TW 104128604A TW 104128604 A TW104128604 A TW 104128604A TW 201618895 A TW201618895 A TW 201618895A
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Taiwan
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grinding
semiconductor strip
outer casing
wheel
housing
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TW104128604A
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Chinese (zh)
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TWI610755B (en
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宋鎭圭
金東右
白興鉉
朴民圭
朴曉善
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舒語科技股份有限公司
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02002Preparing wafers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02002Preparing wafers
    • H01L21/02005Preparing bulk and homogeneous wafers

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)

Abstract

The present invention presents a grinder and semiconductor strip grinder. The grinder comprises a drive motor, a grinding wheel to grind the semiconductor strip by driving the motor to rotate, and a housing unit for protecting the grinding wheel. The housing unit is formed in the way that a pivot shaft on one side rotates to be able to open it while replacing the grinding wheel, so that the molded layer formed on the cell substrate of the semiconductor strip is removed. Therefore, the effect of making the overall thickness of semiconductor strip thin is obtained.

Description

磨削裝置及其所適用的半導體條帶研磨機 Grinding device and its suitable semiconductor strip grinder

本發明關於一種半導體條帶研磨機,更詳細地,關於一種磨削半導體條帶的保護模製層而減少半導體條帶的厚度的磨削裝置及其所適用的半導體條帶研磨機其中該半導體條帶是在基體基板的上部面排列半導體晶片所安裝並封裝的複數個單位基板而成。 The present invention relates to a semiconductor strip grinder, and more particularly to a grinding apparatus for reducing the thickness of a semiconductor strip by grinding a protective mold layer of a semiconductor strip and a semiconductor strip grinder to which the semiconductor is applied The strip is formed by arranging a plurality of unit substrates on which a semiconductor wafer is mounted and packaged on the upper surface of the base substrate.

一般來講,半導體封裝件(package)藉由如下過程而製造。亦即,首先製造半導體晶片,該半導體晶片是在以矽材質製造的半導體基板上形成如電晶體和電容器等高度集成化的電路而成,接著將該半導體晶片附著在如引線框架(lead frame)或印製電路板等條帶材料上,並將該半導體晶片和該條帶材料以金屬絲等電連接以使它們相互通電,接著利用環氧樹脂進行模製以保護半導體晶片免受外部環境影響。 Generally, a semiconductor package is manufactured by the following process. That is, a semiconductor wafer is first fabricated by forming a highly integrated circuit such as a transistor and a capacitor on a semiconductor substrate fabricated on a germanium material, and then attaching the semiconductor wafer to, for example, a lead frame. Or a strip material such as a printed circuit board, and electrically connecting the semiconductor wafer and the strip material to a wire or the like to electrically energize each other, and then molding with an epoxy resin to protect the semiconductor wafer from the external environment. .

這種半導體封裝件封裝成以矩陣型排列在條帶材料上的形態,條帶材料內的各個封裝件被切割而分離成單個,如此地分離成單個的各封裝件在按照預定的質量標準被分選之後,裝載於托盤等而送至後續步驟。 The semiconductor package is packaged in a matrix arrangement on the strip material, and the individual packages in the strip material are cut and separated into individual pieces, thus separated into individual packages which are in accordance with predetermined quality standards. After sorting, it is loaded on a tray or the like and sent to a subsequent step.

模製步驟所完成的形態稱為半導體條帶或半導體材 料,半導體條帶包括複數個半導體封裝件。為了在半導體條帶或半導體材料分離各個半導體封裝件而執行切割步驟。 The form completed by the molding step is called a semiconductor strip or a semiconductor material. The semiconductor strip includes a plurality of semiconductor packages. The cutting step is performed in order to separate the individual semiconductor packages from the semiconductor strip or semiconductor material.

首先,半導體條帶能夠安裝於該製造裝置的吸盤工作臺或切割工作臺。亦即,通過條帶拾取器能夠安裝複數個半導體封裝件所分離之前的半導體條帶。 First, the semiconductor strip can be mounted to a chuck table or a cutting station of the manufacturing apparatus. That is, the strips before the separation of the plurality of semiconductor packages can be mounted by the strip picker.

該半導體條帶通過切割裝置切割成單一封裝件,即單元封裝件。具體來講,半導體條帶在安裝於真空吸盤單元的狀態下通過切割裝置與該真空吸盤單元之間的相對移動而切割成半導體封裝件。 The semiconductor strip is cut into a single package, ie a unit package, by a cutting device. Specifically, the semiconductor strip is cut into a semiconductor package by relative movement between the cutting device and the vacuum chuck unit in a state of being mounted to the vacuum chuck unit.

切割步驟結束之後,複數個半導體封裝件為了進行如清洗和乾燥那樣的後續步驟而通過單元拾取器或封裝件拾取器移動。 After the cutting step is completed, the plurality of semiconductor packages are moved by the unit pickup or the package pickup for subsequent steps such as cleaning and drying.

已進行清洗和乾燥的複數個半導體封裝件通過轉臺(turn table)拾取器而移動至轉臺。在該轉臺能夠執行半導體封裝件的視覺檢查(vision inspection),結束了檢查的半導體封裝件通過分類拾取器而被分類。 The plurality of semiconductor packages that have been cleaned and dried are moved to the turntable by a turn table picker. At the turntable, visual inspection of the semiconductor package can be performed, and the semiconductor package that has finished inspection is sorted by the sorting pickup.

例如,下述專利文獻1和專利文獻2中公開有半導體條帶和半導體製造裝置的吸附單元構成。 For example, Patent Document 1 and Patent Document 2 below disclose a semiconductor strip and an adsorption unit configuration of a semiconductor manufacturing apparatus.

專利文獻1中記載有一種基板條帶的構成,該基板條帶包括:基體基板,其呈長方形;複數個單位基板,其劃分基體基板而形成;模具澆口,其形成於位於基體基板長邊的複數個單位基板的一部分;以及模型(dummy),其劃分基體基板而形成於基體基板的彼此相對的兩個短邊。 Patent Document 1 describes a configuration of a substrate strip including: a base substrate having a rectangular shape; a plurality of unit substrates formed by dividing a base substrate; and a mold gate formed on a long side of the base substrate a part of a plurality of unit substrates; and a dummy which is formed on the base substrate and formed on the two short sides of the base substrate facing each other.

專利文獻2中記載有一種半導體製造裝置用吸附單元的構成,該半導體製造裝置用吸附單元包括:吸附墊,其用於吸附半導體條帶或複數個半導體封裝件;以及本體,其具有用於容納吸附墊的吸附墊容納部,吸附墊在以與吸附墊容納部的外圍尺寸對應的方式形成之後附著於吸附墊容納部。 Patent Document 2 describes a configuration of an adsorption unit for a semiconductor manufacturing apparatus including: an adsorption pad for adsorbing a semiconductor strip or a plurality of semiconductor packages; and a body having a body for accommodating The adsorption pad accommodating portion of the adsorption pad is attached to the adsorption pad accommodating portion after being formed in a manner corresponding to the outer size of the adsorption pad accommodating portion.

先前技術文獻 Prior technical literature 專利文獻 Patent literature

專利文獻1:韓國發明專利授權公報第10-0872129號(2008年12月8日公告) Patent Document 1: Korean Invention Patent Authorization Gazette No. 10-0872129 (announcement on December 8, 2008)

專利文獻2:韓國發明專利公開公報第10-2014-0024627號(2014年3月3日公開) Patent Document 2: Korean Patent Publication No. 10-2014-0024627 (published on March 3, 2014)

然而在先前技術中,由於半導體條帶為了保護設置於基體基板的各單位基板而在單位基板外圍形成保護模製層,而該保護模製層不僅形成於單位基板的左右、前後,而且在單位基板的上部也形成,因此,存在半導體條帶的整體厚度變厚的問題。 However, in the prior art, since the semiconductor strip forms a protective molding layer on the periphery of the unit substrate in order to protect the unit substrates provided on the base substrate, the protective molding layer is formed not only on the left and right sides of the unit substrate, but also in the unit. Since the upper portion of the substrate is also formed, there is a problem that the overall thickness of the semiconductor strip becomes thick.

亦即,在先前技術中,由於並無能夠磨削半導體條帶的保護模製層的半導體條帶研磨機,因此,存在只能依舊使用厚度因保護模製層而變厚的半導體條帶的問題。 That is, in the prior art, since there is no semiconductor strip grinder capable of grinding the protective mold layer of the semiconductor strip, there is a semiconductor strip which can only be thickened by the thickness of the protective mold layer. problem.

此外,過去在磨削加工半導體條帶時,僅在一側噴射切削液,因此,難以向砂輪及半導體條帶整個表面供給切 削液,且縮短砂輪的使用壽命,因而存在砂輪的更換周期短且不便進行更換作業的問題。 In addition, in the past, when the semiconductor strip was ground, the cutting fluid was sprayed only on one side, so it was difficult to supply the entire surface of the grinding wheel and the semiconductor strip. The liquid is cut and the service life of the grinding wheel is shortened, so that the replacement cycle of the grinding wheel is short and the replacement work is inconvenient.

本發明旨在解決如上所述的問題,本發明的目的在於提供一種磨削裝置及其所適用的半導體條帶研磨機,該磨削裝置去除半導體條帶的單位基板上部的模製層而能夠使半導體條帶的整體厚度變薄。 The present invention has been made in an effort to solve the above problems, and an object of the present invention is to provide a grinding apparatus and a semiconductor strip grinding machine to which the same is applied, which can remove a molding layer on an upper portion of a unit substrate of a semiconductor strip. The overall thickness of the semiconductor strip is made thin.

本發明的另一目的在於提供一種磨削裝置及其所適用的半導體條帶研磨機,該磨削裝置向砂輪和半導體條帶有效地噴射切削液而能夠提高磨削作業的精度。 Another object of the present invention is to provide a grinding apparatus and a semiconductor strip grinding machine to which the same is applied, which can efficiently jet a cutting fluid to a grinding wheel and a semiconductor strip, thereby improving the precision of the grinding operation.

本發明的其它目的在於提供一種能夠容易地更換砂輪的磨削裝置及半導體條帶研磨機。 Another object of the present invention is to provide a grinding apparatus and a semiconductor strip grinder which can easily replace a grinding wheel.

本發明為了達到如上所述的目的而提供一種磨削裝置,根據本發明的磨削裝置其特徵在於,包括:驅動馬達;砂輪,其通過該驅動馬達的旋轉而磨削半導體條帶;以及外殼部,其保護該砂輪,該外殼部以在更換該砂輪時使一側樞軸旋轉而能夠敞開的方式形成。 The present invention provides a grinding apparatus for achieving the object as described above, the grinding apparatus according to the present invention comprising: a drive motor; a grinding wheel that grinds the semiconductor strip by rotation of the drive motor; and an outer casing The portion protects the grinding wheel, and the outer casing portion is formed to be openable by pivoting one side when the grinding wheel is replaced.

此外,本發明為了達到如上所述的目的而提供一種磨削裝置所適用的半導體條帶研磨機,根據本發明的磨削裝置所適用的半導體條帶研磨機其特徵在於,包括:磨削裝置,其將半導體條帶的保護模製層磨削而去除;真空吸盤單元,其固定並清洗半導體條帶;第一拾取器,其將半導體條帶依次載入於該真空吸盤單元;乾燥單元,其將由該磨削裝置所磨削的半導體條帶進行乾燥;以及第二拾取 器,其將在該磨削裝置所磨削的半導體條帶載入於該乾燥單元。 Further, in order to achieve the above object, the present invention provides a semiconductor strip grinder to which a grinding apparatus is applied, and a semiconductor strip grinder to which the grinding apparatus according to the present invention is applied is characterized in that it comprises: a grinding apparatus And removing the protective molding layer of the semiconductor strip; the vacuum chuck unit fixing and cleaning the semiconductor strip; the first picker loading the semiconductor strip sequentially to the vacuum chuck unit; the drying unit, It will dry the semiconductor strip ground by the grinding device; and the second pick And loading a semiconductor strip ground by the grinding device into the drying unit.

如上所述,利用根據本發明的磨削裝置及其所適用的半導體條帶研磨機,由於去除形成於半導體條帶的單位基板上部的模製層,因而得到能夠使半導體條帶的整體厚度變薄的效果。 As described above, with the grinding apparatus according to the present invention and the semiconductor strip mill to which it is applied, since the molding layer formed on the upper portion of the unit substrate of the semiconductor strip is removed, it is possible to change the overall thickness of the semiconductor strip. Thin effect.

而且,根據本發明,由於在砂輪的兩側分別設置噴嘴並在前後側設置噴射管,因而得到能夠從前後左右各側面朝向砂輪和半導體條帶的磨削面而整體上噴射切削液的效果。 Moreover, according to the present invention, since the nozzles are provided on both sides of the grinding wheel and the injection pipes are provided on the front and rear sides, the effect of ejecting the cutting fluid as a whole from the grinding surfaces of the grinding wheel and the semiconductor strip from the front, rear, left and right side faces is obtained.

由此,根據本發明,由於有效地潤滑砂輪與半導體條帶的磨削面之間,因而得到降低進行磨削作業時的砂輪的磨損,並冷卻砂輪而能夠延長砂輪的使用壽命,且能夠提高磨削作業精度的效果。 Therefore, according to the present invention, since the grinding wheel and the grinding surface of the semiconductor strip are effectively lubricated, it is possible to reduce the wear of the grinding wheel during the grinding operation, and to cool the grinding wheel, thereby prolonging the service life of the grinding wheel and improving the life of the grinding wheel. The effect of grinding accuracy.

此外,根據本發明,由於在更換砂輪時利用鎖定單元而固定驅動軸,因而得到能夠容易更換砂輪的效果。 Further, according to the present invention, since the drive shaft is fixed by the lock unit when the grinding wheel is replaced, an effect that the grinding wheel can be easily replaced can be obtained.

此外,根據本發明,由於利用檢測單元而檢測輪外殼的配合狀態,並以僅在輪外殼所完全配合的狀態下使驅動馬達驅動的方式進行控制,因而得到能夠將在沒有完全配合的狀態下驅動馬達的驅動所導致的驅動軸的損傷或故障防患於未然的效果。 Further, according to the present invention, since the fitting state of the wheel housing is detected by the detecting unit and the driving motor is driven only in a state in which the wheel housing is fully engaged, it is possible to obtain a state in which it is not fully fitted. The damage or malfunction of the drive shaft caused by the drive of the drive motor prevents the prior effect.

10‧‧‧半導體條帶研磨機 10‧‧‧Semiconductor strip grinder

11‧‧‧外殼 11‧‧‧Shell

12‧‧‧基體 12‧‧‧ base

20‧‧‧真空吸盤單元 20‧‧‧vacuum suction cup unit

21‧‧‧吸盤工作臺 21‧‧‧Sucker Workbench

22‧‧‧Y軸機器人 22‧‧‧Y-axis robot

30‧‧‧第一拾取器 30‧‧‧First picker

30’‧‧‧第二拾取器 30’‧‧‧Second Picker

40‧‧‧磨削裝置 40‧‧‧ grinding device

41‧‧‧砂輪 41‧‧‧ grinding wheel

42‧‧‧外殼部 42‧‧‧ Shell

43‧‧‧X軸機器人 43‧‧‧X-axis robot

44‧‧‧Z軸機器人 44‧‧‧Z-axis robot

45‧‧‧支撐板 45‧‧‧Support board

46‧‧‧距離檢測感測器 46‧‧‧ Distance detection sensor

47‧‧‧驅動軸 47‧‧‧ drive shaft

48‧‧‧噴嘴 48‧‧‧Nozzles

50‧‧‧乾燥單元 50‧‧‧Drying unit

60‧‧‧鎖定單元 60‧‧‧Locking unit

61‧‧‧鎖定板 61‧‧‧Locking plate

62‧‧‧固定板 62‧‧‧ fixed plate

63‧‧‧配合孔 63‧‧‧With holes

64‧‧‧固定孔 64‧‧‧Fixed holes

65‧‧‧延伸部 65‧‧‧Extension

66‧‧‧卡坎 66‧‧‧Kakán

70‧‧‧檢測單元 70‧‧‧Detection unit

110‧‧‧第一裝載部 110‧‧‧First Loading Department

111‧‧‧料盒 111‧‧‧material box

112‧‧‧料盒移動機器人 112‧‧‧Box mobile robot

120‧‧‧供給模組 120‧‧‧Supply module

130‧‧‧檢查模組 130‧‧‧Check module

131‧‧‧視覺軌道 131‧‧‧ visual orbit

132‧‧‧視覺機器人 132‧‧‧Visual Robot

140‧‧‧第二裝載部 140‧‧‧Second Loading Department

141‧‧‧裝載機器人 141‧‧‧Loading robot

411‧‧‧驅動輪 411‧‧‧ drive wheel

412‧‧‧磨削部 412‧‧‧ Grinding Department

421‧‧‧輪外殼 421‧‧‧ wheel housing

422‧‧‧罩 422‧‧ hood

423‧‧‧馬達外殼 423‧‧‧Motor housing

424‧‧‧第一外殼 424‧‧‧ first casing

425‧‧‧第二外殼 425‧‧‧ second casing

471‧‧‧固定蓋 471‧‧‧Fixed cover

472‧‧‧固定突部 472‧‧‧Fixed protrusion

481‧‧‧噴射管 481‧‧‧Steam tube

482‧‧‧噴射孔 482‧‧‧Spray hole

圖1是根據本發明的較佳實施例的磨削裝置所適用的 半導體條帶研磨機的立體圖。 Figure 1 is a view of a grinding apparatus according to a preferred embodiment of the present invention A perspective view of a semiconductor strip mill.

圖2是圖1中所圖示的半導體條帶研磨機的去除外殼之後的俯視圖。 2 is a top plan view of the semiconductor strip grinder of FIG. 1 after removal of the outer casing.

圖3是根據本發明的較佳實施例的磨削裝置的立體圖。 Figure 3 is a perspective view of a grinding apparatus in accordance with a preferred embodiment of the present invention.

圖4是示出圖3中所圖示的磨削裝置的敞開了輪外殼的狀態的例示圖。 4 is an explanatory view showing a state in which the wheel housing of the grinding device illustrated in FIG. 3 is opened.

圖5和圖6是鎖定板的動作狀態圖。 5 and 6 are views showing an operation state of the lock plate.

以下參照圖式詳細說明根據本發明的較佳實施例的磨削裝置及其所適用的半導體條帶研磨機。 DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, a grinding apparatus and a semiconductor strip grinder to which the same is applied according to a preferred embodiment of the present invention will be described in detail with reference to the drawings.

在以下描述中,以圖式中所圖示的狀態為基準而定義“上方”、“下方”、“前方”、“後方”及其它各方向性用語。 In the following description, "upper", "lower", "front", "rear", and other directional terms are defined on the basis of the state illustrated in the drawings.

圖1是根據本發明的較佳實施例的磨削裝置所適用的半導體條帶研磨機的立體圖,圖2是圖1中所圖示的半導體條帶研磨機的去除外殼之後的俯視圖。 1 is a perspective view of a semiconductor strip grinder to which a grinding apparatus according to a preferred embodiment of the present invention is applied, and FIG. 2 is a plan view of the semiconductor strip grinder of FIG. 1 after removing the outer casing.

如圖1和圖2中所圖示,根據本發明的較佳實施例的磨削裝置所適用的半導體條帶研磨機10包括:真空吸盤單元20,其固定並清洗半導體條帶以便去除半導體條帶的保護模製層;第一拾取器30,其將半導體條帶依次載入於真空吸盤單元20;磨削裝置40,其將載入於真空吸盤單元20的半導體條帶的保護模製層磨削而去除;乾燥單元50,其將由磨削裝置40所磨削的半導體條帶進行乾 燥;以及第二拾取器30’,其將在磨削裝置40所磨削的半導體條帶載入於乾燥單元50。 As illustrated in FIGS. 1 and 2, a semiconductor strip grinder 10 to which a grinding apparatus according to a preferred embodiment of the present invention is applied includes a vacuum chuck unit 20 that fixes and cleans a semiconductor strip to remove a semiconductor strip. a protective molding layer of the tape; a first pickup 30 that sequentially loads the semiconductor strips to the vacuum chuck unit 20; and a grinding device 40 that will load the protective molding layer of the semiconductor strips of the vacuum chuck unit 20. Grinding and removing; drying unit 50, which performs the drying of the semiconductor strips ground by the grinding device 40 Drying; and a second picker 30' that loads the semiconductor strip ground by the grinding device 40 into the drying unit 50.

並且,根據本發明的較佳實施例的磨削裝置所適用的半導體條帶研磨機10能夠進一步包括:第一裝載部110,其具有裝載空間,裝載有所要執行磨削作業的半導體條帶的複數個料盒(magazine)111裝載於該裝載空間;供給模組120,其向磨削裝置40依次逐個供給裝載於各料盒111的半導體條帶;檢查模組130,其檢查磨削作業結束的半導體條帶的精度;以及第二裝載部140,其裝載檢查結束的半導體條帶。 Also, the semiconductor strip grinder 10 to which the grinding apparatus according to the preferred embodiment of the present invention is applied can further include: a first loading portion 110 having a loading space loaded with a semiconductor strip to be subjected to a grinding operation A plurality of magazines 111 are loaded in the loading space; a supply module 120 supplies the semiconductor strips loaded in the cartridges 111 one by one to the grinding device 40 one by one; and an inspection module 130 that checks the end of the grinding operation The accuracy of the semiconductor strip; and a second loading portion 140 that carries the semiconductor strip that is inspected.

如此地,本發明能夠在一個外殼11內部設置執行磨削、清洗、乾燥、檢查等各個步驟的各設備和用於提供各個步驟所需的切削液、清洗水或真空壓力的儲罐和泵等。 Thus, the present invention can provide each apparatus for performing various steps of grinding, washing, drying, inspection, and the like, and a storage tank and a pump for supplying cutting fluid, washing water or vacuum pressure required for each step, etc. .

在外殼11的前表面能夠設置顯示各設備的動作狀態的顯示面板和用於設定各設備的動作並控制動作的操作面板。 A display panel that displays an operation state of each device and an operation panel for setting the operation of each device and controlling the operation can be provided on the front surface of the casing 11.

如此地,本發明構成如下:以真空吸盤單元為中心在兩側分別設置有第一裝載部、乾燥單元、檢查模組、第二裝載部,並利用供給模組和第一拾取器、第二拾取器而使半導體條帶一邊沿著一條直線依次移動一邊執行各個步驟。 In this way, the present invention is configured as follows: a first loading unit, a drying unit, an inspection module, and a second loading unit are respectively disposed on both sides of the vacuum chuck unit, and the supply module and the first pickup and the second are utilized. The pickup performs the respective steps while sequentially moving the semiconductor strips along a straight line.

由此,本發明使去除半導體條帶的保護模製層的整個過程的移動距離最小化,從而能夠提高作業速度,且簡化整體裝置內部的構成,從而能夠使空間利用率極大化。 Thus, the present invention minimizes the moving distance of the entire process of removing the protective mold layer of the semiconductor strip, thereby improving the work speed and simplifying the internal configuration of the entire apparatus, thereby making it possible to maximize the space utilization.

在本實施例中,將半導體條帶沿著一條直線(X軸方向)依次移動的方向稱為“半導體條帶輸送方向”。 In the present embodiment, the direction in which the semiconductor strips are sequentially moved along a straight line (X-axis direction) is referred to as "semiconductor strip transport direction".

在第一裝載部110能夠設置使料盒111朝向上方或下方移動的料盒移動機器人112,從而使裝載有半導體條帶的料盒111移動至預定的位置而使裝載於料盒111的半導體條帶向磨削裝置40側供給。 The cartridge moving robot 112 that moves the cartridge 111 upward or downward can be disposed at the first loading portion 110, thereby moving the cartridge 111 loaded with the semiconductor strip to a predetermined position to load the semiconductor strip loaded on the cartridge 111. The belt is supplied to the side of the grinding device 40.

檢查模組130能夠包括:檢查磨削作業結束的半導體條帶的厚度的厚度檢查機器人;從第二拾取器30’接受磨削作業結束的半導體條帶的傳遞並將該半導體條帶向第二裝載部140側輸送的視覺軌道131;以及拍攝沿著視覺軌道131輸送的半導體條帶而執行視覺檢查的視覺機器人132。 The inspection module 130 can include: a thickness inspection robot that checks the thickness of the semiconductor strip at the end of the grinding operation; receives the transfer of the semiconductor strip from the end of the grinding operation from the second pickup 30' and brings the semiconductor strip to the second A visual orbit 131 that is transported on the side of the loading unit 140; and a visual robot 132 that performs a visual inspection by capturing a semiconductor strip that is transported along the visual orbit 131.

在第二裝載部140能夠設置裝載機器人141,該裝載機器人141使料盒111朝向上方或下方移動以便在所要裝載已完成至檢查作業的半導體條帶的空料盒111內部裝載半導體條帶,並使裝載結束的料盒111朝向裝載空間移動。 The loading robot 141 can be disposed at the second loading portion 140, and the loading robot 141 moves the cartridge 111 upward or downward to load a semiconductor strip inside the empty cartridge 111 to which the semiconductor strip that has been completed to the inspection operation is to be loaded, and The loading end of the cartridge 111 is moved toward the loading space.

真空吸盤單元20發揮如下功能:在固定半導體條帶並使半導體條帶移動至磨削裝置40的下部而進行磨削作業、清洗作業、以及厚度檢查作業時,使半導體條帶沿著預定的方向僅移動預定距離。 The vacuum chuck unit 20 functions to cause the semiconductor strip to follow a predetermined direction when the semiconductor strip is fixed and the semiconductor strip is moved to the lower portion of the grinding device 40 to perform a grinding operation, a cleaning operation, and a thickness inspection operation. Move only the predetermined distance.

為此,真空吸盤單元20能夠包括:吸盤工作臺21,其形成真空而以吸附方式來固定半導體條帶;Y軸機器人22,其使吸盤工作臺21沿與半導體條帶的輸送方向垂直 的方向移動;真空泵,其連接於吸盤工作臺21並形成真空以產生抽吸力;以及清洗水泵(圖式中未圖示),其向吸盤工作臺21供給清洗水。 To this end, the vacuum chuck unit 20 can include a chuck table 21 that forms a vacuum to fix the semiconductor strip in an adsorbed manner, and a Y-axis robot 22 that causes the chuck table 21 to be perpendicular to the transport direction of the semiconductor strip The direction of movement; a vacuum pump connected to the chuck table 21 and forming a vacuum to generate a suction force; and a washing water pump (not shown) that supplies the washing water to the chuck table 21.

以下參照圖3和圖4詳細說明根據本發明的較佳實施例的磨削裝置的構成。 The constitution of the grinding apparatus according to the preferred embodiment of the present invention will be described in detail below with reference to FIGS. 3 and 4.

圖3是根據本發明的較佳實施例的磨削裝置的立體圖,圖4是示出圖3中所圖示的磨削裝置的敞開了輪外殼的狀態的例示圖。 3 is a perspective view of a grinding apparatus according to a preferred embodiment of the present invention, and FIG. 4 is an explanatory view showing a state in which the wheel housing of the grinding apparatus illustrated in FIG. 3 is opened.

根據本發明的較佳實施例的磨削裝置40磨削半導體條帶200的上部面而去除保護模製層,從而使半導體條帶的厚度最小化。 The grinding apparatus 40 in accordance with a preferred embodiment of the present invention grinds the upper face of the semiconductor strip 200 to remove the protective molding layer, thereby minimizing the thickness of the semiconductor strip.

為此,如圖3和圖4中所圖示,根據本發明的較佳實施例的磨削裝置40包括:驅動馬達;砂輪41,其通過該驅動馬達的旋轉而磨削半導體條帶;外殼部42,其保護砂輪41;X軸機器人43和Z軸機器人44(參照圖2),其使外殼部42分別朝向X軸方向和Z軸方向移動;支撐板45,其連接外殼部42與Z軸機器人44;以及距離檢測感測器46,其檢測砂輪41與半導體條帶之間的距離。 To this end, as illustrated in Figures 3 and 4, a grinding apparatus 40 in accordance with a preferred embodiment of the present invention includes: a drive motor; a grinding wheel 41 that grinds the semiconductor strip by rotation of the drive motor; a portion 42 that protects the grinding wheel 41; an X-axis robot 43 and a Z-axis robot 44 (refer to FIG. 2) that move the outer casing portion 42 toward the X-axis direction and the Z-axis direction, respectively; and a support plate 45 that connects the outer casing portions 42 and Z An axis robot 44; and a distance detecting sensor 46 that detects the distance between the grinding wheel 41 and the semiconductor strip.

砂輪41能夠包括:驅動輪411,其與傳遞驅動馬達的驅動力的主軸(spindle)即驅動軸47配合而旋轉;以及磨削部412,其安裝於驅動輪411的外圍而磨削半導體條帶。 The grinding wheel 41 can include a driving wheel 411 that rotates in cooperation with a spindle that transmits a driving force of the driving motor, that is, a driving shaft 47, and a grinding portion 412 that is attached to the periphery of the driving wheel 411 to grind the semiconductor strip .

驅動輪411能夠以如鋁那樣較輕的金屬材質來製造。 The drive wheel 411 can be made of a light metal material such as aluminum.

磨削部412其直徑大致為150mm且厚度大致為20至30mm,磨削部412能夠以輥(roll)的形狀設置在驅動輪411 的外圍。這種磨削部412能夠以如樹脂金剛石或金屬金剛石那樣具有強度和硬度的材質來製造。 The grinding portion 412 has a diameter of approximately 150 mm and a thickness of approximately 20 to 30 mm, and the grinding portion 412 can be disposed in the shape of a roll on the driving wheel 411 The periphery. Such a grinding portion 412 can be manufactured from a material having strength and hardness such as resin diamond or metal diamond.

在磨削部412磨損時,將驅動輪411和磨削部412一體更換或僅更換磨削部412,由此能夠提高磨削的精度並能夠容易地實現磨削裝置40的更換。 When the grinding portion 412 is worn, the drive wheel 411 and the grinding portion 412 are integrally replaced or only the grinding portion 412 is replaced, whereby the accuracy of the grinding can be improved and the replacement of the grinding device 40 can be easily achieved.

在磨削裝置40利用驅動馬達的驅動力就能夠變更砂輪41的旋轉速度。例如在本實施例中,砂輪41的旋轉速度平均大致為3,000rpm,最大能夠實行至大致9,000rpm。 The grinding device 40 can change the rotational speed of the grinding wheel 41 by the driving force of the drive motor. For example, in the present embodiment, the rotational speed of the grinding wheel 41 is approximately 3,000 rpm on average, and can be performed up to approximately 9,000 rpm.

此外,磨削裝置40雖然能夠轉用於半導體條帶的寬度例如大致為62mm/74mm/95mm且長度例如大致為220mm/240mm/250mm的半導體條帶尺寸而適用,但並不限定於此,也能夠適用於多種條帶尺寸。 Further, the grinding device 40 can be applied to a semiconductor strip having a width of, for example, approximately 62 mm/74 mm/95 mm and a length of, for example, approximately 220 mm/240 mm/250 mm, but is not limited thereto. Can be applied to a variety of strip sizes.

距離檢測感測器46能夠設置於外殼部42而檢測砂輪41與半導體條帶之間的距離。 The distance detecting sensor 46 can be disposed in the outer casing portion 42 to detect the distance between the grinding wheel 41 and the semiconductor strip.

距離檢測感測器46在最初安裝磨削裝置40時、分離距離檢測感測器46時、更換磨削裝置40時、更換吸盤工作臺21時檢測磨削裝置40的高度,距離檢測感測器46的檢測信號傳輸至控制部。 The distance detecting sensor 46 detects the height of the grinding device 40 when the grinding device 40 is initially installed, when the distance detecting sensor 46 is separated, when the grinding device 40 is replaced, when the chuck table 21 is replaced, and the distance detecting sensor The detection signal of 46 is transmitted to the control unit.

由此,控制部利用在距離檢測感測器46所檢測的信號而控制X軸機器人43和Z軸機器人44的驅動,從而能夠以精密地磨削半導體條帶的保護模製層的方式進行控制。 Thereby, the control unit controls the driving of the X-axis robot 43 and the Z-axis robot 44 by the signal detected by the distance detecting sensor 46, so that the protective molding layer of the semiconductor strip can be precisely ground. .

此處,控制部能夠控制如下:在將磨削的精度以Z軸為基準維持了大致±0.01mm的狀態下利用磨削裝置40以 依次研磨方式執行磨削作業。 Here, the control unit can be controlled by the grinding device 40 in a state where the accuracy of the grinding is maintained at approximately ±0.01 mm with respect to the Z axis. The grinding operation is performed in the order of grinding.

另一方面,在本實施例中如圖4中所圖示,外殼部42可形成為通過樞軸旋轉而能夠敞開的構造以便能夠容易地更換砂輪41。 On the other hand, in the present embodiment, as illustrated in FIG. 4, the outer casing portion 42 may be formed in a configuration that can be opened by pivoting so that the grinding wheel 41 can be easily replaced.

詳細說明如下。外殼部42能夠包括:輪外殼421,其內部形成有設置砂輪41的空間,且下表面形成有開口部以使砂輪突出;罩422,其以能夠敞開或封閉輪外殼421的前表面的方式配合;以及馬達外殼423,其與輪外殼421的後端部配合且其內部設置驅動馬達。 The details are as follows. The outer casing portion 42 can include a wheel housing 421 having a space in which the grinding wheel 41 is disposed, and a lower surface is formed with an opening to protrude the grinding wheel, and a cover 422 that is configured to be capable of opening or closing the front surface of the wheel housing 421. And a motor housing 423 that mates with a rear end portion of the wheel housing 421 and that is internally provided with a drive motor.

馬達外殼423形成為大致長方體的形狀,其內部形成有設置驅動馬達的空間,且通過支撐部件能夠與支撐板45配合。在馬達外殼423的一側能夠設置距離檢測感測器46。 The motor housing 423 is formed in a substantially rectangular parallelepiped shape, and a space in which a drive motor is provided is formed inside, and can be engaged with the support plate 45 by a support member. A distance detecting sensor 46 can be disposed on one side of the motor housing 423.

輪外殼421能夠包括第一外殼424和第二外殼425,該第一外殼424和該第二外殼425被左右分割以便在更換砂輪41時使一側部樞軸旋轉而能夠敞開,且在配合時形成長方體形狀。 The wheel housing 421 can include a first housing 424 and a second housing 425 that are split left and right to allow one side to pivot while being replaced when the grinding wheel 41 is replaced, and when mated Form a rectangular parallelepiped shape.

第一外殼424形成輪外殼421的左側部和背面部,第二外殼425形成輪外殼421的右側部,在第一外殼424與第二外殼425的中央部能夠形成設置砂輪41的空間。就第二外殼425而言,其左側上端部與第一外殼424的背面板樞軸配合而進行樞軸旋轉運動,從而能夠敞開。 The first outer casing 424 forms a left side portion and a rear surface portion of the wheel housing 421, and the second outer casing 425 forms a right side portion of the wheel housing 421, and a space in which the grinding wheel 41 is disposed can be formed at a central portion of the first outer casing 424 and the second outer casing 425. As for the second outer casing 425, the upper left end portion thereof pivotally engages with the rear plate of the first outer casing 424 to perform a pivotal movement so as to be openable.

在這種第一外殼424和第二外殼425的下端部內側能夠各自設置進行磨削作業時向砂輪41噴射切削液的噴嘴 48。 On the inner side of the lower end portions of the first outer casing 424 and the second outer casing 425, nozzles for jetting the cutting fluid to the grinding wheel 41 during the grinding operation can be provided. 48.

此處,各噴嘴48各自能夠以僅傾斜預定的角度的方式設置以便朝向砂輪41的下端部噴射切削液。 Here, each of the nozzles 48 can be disposed to be inclined only by a predetermined angle so as to eject the cutting fluid toward the lower end portion of the grinding wheel 41.

此外,在第二外殼425的一側例如右側能夠連接供給切削液的供給管,在第二外殼425的另一側例如左側下端能夠設置一對噴射管481,該一對噴射管481以砂輪41為中心在前後側僅隔開預定的距離。 Further, a supply pipe for supplying cutting fluid can be connected to one side, for example, the right side of the second outer casing 425, and a pair of injection pipes 481 can be provided at the other lower side of the second outer casing 425, for example, the lower left end, and the pair of injection pipes 481 are provided with grinding wheels 41. The center is separated by a predetermined distance on the front and rear sides.

一對噴射管481發揮在砂輪的前側和後側分別噴射切削液的功能,在一對噴射管481的下表面分別能夠以預定的間距形成複數個噴射孔482。 The pair of injection pipes 481 function to eject the cutting fluid on the front side and the rear side of the grinding wheel, respectively, and a plurality of injection holes 482 can be formed at a predetermined pitch on the lower surfaces of the pair of injection pipes 481.

如此地,本發明在砂輪的兩側分別設置噴嘴並在前後側設置噴射管,從而能夠從前後左右各側面朝向砂輪和半導體條帶的磨削面噴射切削液。 As described above, according to the present invention, the nozzles are provided on both sides of the grinding wheel, and the injection pipes are provided on the front and rear sides, so that the cutting fluid can be ejected from the front, rear, left and right side faces toward the grinding wheel and the grinding surface of the semiconductor strip.

由此,本發明向砂輪和半導體條帶的磨削面噴射切削液而有效地進行潤滑,從而降低進行磨削作業時的砂輪的磨損,並冷卻砂輪而能夠延長砂輪的使用壽命,且能夠提高磨削作業精度。 Therefore, the present invention efficiently discharges the cutting fluid by spraying the cutting fluid to the grinding surface of the grinding wheel and the semiconductor strip, thereby reducing the wear of the grinding wheel during the grinding operation, and cooling the grinding wheel, thereby prolonging the service life of the grinding wheel and improving the life of the grinding wheel. Grinding accuracy.

另一方面,在輪外殼421能夠設置以防止驅動軸47旋轉的方式進行鎖定的鎖定單元60。 On the other hand, the wheel housing 421 can be provided with a locking unit 60 that locks in such a manner as to prevent the drive shaft 47 from rotating.

鎖定單元60能夠包括:設置於第一外殼424的背面板的鎖定板61;以及將鎖定板61能夠水平移動地固定在第一外殼424的固定板62。 The locking unit 60 can include: a locking plate 61 disposed on the back panel of the first housing 424; and a fixing plate 62 that fixes the locking plate 61 to the first housing 424 in a horizontally movable manner.

鎖定板61發揮在進行砂輪41的更換作業時鎖定驅動軸47的功能。 The lock plate 61 functions to lock the drive shaft 47 when the replacement work of the grinding wheel 41 is performed.

例如,圖5和圖6是鎖定板的動作狀態圖。 For example, FIGS. 5 and 6 are operational state diagrams of the lock plate.

圖5中圖示有解除了驅動軸的鎖定的狀態,圖6中圖示有使鎖定板移動而鎖定了驅動軸的狀態。 FIG. 5 illustrates a state in which the locking of the drive shaft is released, and FIG. 6 illustrates a state in which the lock plate is moved to lock the drive shaft.

為了更換砂輪41須分離與驅動軸47的前端配合的固定蓋471,而驅動軸47在驅動馬達未驅動時自如地旋轉。 In order to replace the grinding wheel 41, the fixed cover 471 to be engaged with the front end of the drive shaft 47 is separated, and the drive shaft 47 is freely rotated when the drive motor is not driven.

此處,在驅動軸47的前端部設置有固定突部472,在該固定突部472的上端和下端形成有相互平行的平面。 Here, a fixing protrusion 472 is provided at the front end portion of the drive shaft 47, and planes parallel to each other are formed at the upper end and the lower end of the fixing protrusion 472.

由此,作業人員須在用一隻手利用扳手固定了驅動軸47的狀態下用另一隻手使固定蓋471旋轉而進行分離,因此,固定蓋471的分離作業是一種非常不便且困難的作業。 Therefore, the operator has to rotate the fixed cover 471 with the other hand in a state where the drive shaft 47 is fixed by one hand with a wrench, and the separation work of the fixed cover 471 is a very inconvenient and difficult. operation.

為了解決這種問題,在本實施例中鎖定板61形成為大致長方形板形狀,且在鎖定板61的中央部形成有配合孔63,該配合孔63形成為圓形以與驅動軸47的剖面對應,在配合孔63的一側能夠以與配合孔63連通的方式形成固定孔64,該固定孔64以與固定突部472的剖面形狀對應的方式在上端和下端具有直線部。 In order to solve such a problem, in the present embodiment, the lock plate 61 is formed in a substantially rectangular plate shape, and a fitting hole 63 is formed in a central portion of the lock plate 61, and the fitting hole 63 is formed in a circular shape to be in cross section with the drive shaft 47. Correspondingly, a fixing hole 64 can be formed on one side of the fitting hole 63 so as to communicate with the fitting hole 63, and the fixing hole 64 has a straight portion at the upper end and the lower end so as to correspond to the cross-sectional shape of the fixing protrusion 472.

因此,如圖5中所圖示,鎖定板61在平常使用磨削裝置40的情況下設置於左側以使配合孔63位於固定突部472。 Therefore, as illustrated in FIG. 5, the lock plate 61 is disposed on the left side in the case where the grinding device 40 is normally used so that the fitting hole 63 is located at the fixing protrusion 472.

如圖6中所圖示,在更換砂輪41的情況下,若使鎖定板61朝向右側移動,則固定孔64位於固定突部472,因此鎖定驅動軸47以防其旋轉。 As illustrated in Fig. 6, in the case where the grinding wheel 41 is replaced, if the lock plate 61 is moved toward the right side, the fixing hole 64 is located at the fixing protrusion 472, thereby locking the drive shaft 47 against rotation.

在這種鎖定板61的兩側能夠分別形成延伸部65,且 在形成於一側例如右側的延伸部65的前端能夠朝向前方彎折形成卡坎66。 An extension portion 65 can be formed on both sides of such a locking plate 61, and The front end of the extending portion 65 formed on one side, for example, the right side, can be bent toward the front to form the dam 66.

卡坎66在更換砂輪41時發揮為了鎖定驅動軸47而使鎖定板61移動的把手功能,並且在更換砂輪41之後裝配第一外殼424和第二外殼425的過程中卡定在第二外殼425內表面,從而能夠徹底地解除鎖定板61對於驅動軸47的鎖定狀態。 The cardan 66 functions as a handle for moving the lock plate 61 to lock the drive shaft 47 when the grinding wheel 41 is replaced, and is locked to the second outer casing 425 during the assembly of the first outer casing 424 and the second outer casing 425 after the replacement of the grinding wheel 41. The inner surface is such that the locked state of the lock plate 61 with respect to the drive shaft 47 can be completely released.

在固定板62的內部形成有移動空間使得鎖定板61能夠朝向水平方向移動,且在固定板62的右側端能夠形成鎖定板61的卡坎66所插入的插入槽。 A moving space is formed inside the fixing plate 62 so that the locking plate 61 can be moved in the horizontal direction, and an insertion groove into which the card 66 of the locking plate 61 is inserted can be formed at the right end of the fixing plate 62.

並且,在第一外殼424的背面板能夠設置檢測第二外殼425的配合狀態的檢測單元70。 Also, a detecting unit 70 that detects the fitted state of the second outer casing 425 can be provided on the back panel of the first outer casing 424.

檢測單元70能夠包括檢測開關,該檢測開關檢測第一外殼424和第二外殼425的配合與否並輸出接通或斷開信號。 The detecting unit 70 can include a detecting switch that detects the cooperation of the first housing 424 and the second housing 425 and outputs an ON or OFF signal.

因此,控制部根據在檢測單元70輸出的信號而判斷第一外殼424和第二外殼425的配合狀態,且能夠以僅在第一外殼424和第二外殼425所完全地配合的狀態下使驅動馬達驅動的方式進行控制。 Therefore, the control unit judges the mating state of the first outer casing 424 and the second outer casing 425 based on the signal output from the detecting unit 70, and can drive the motor only in a state in which the first outer casing 424 and the second outer casing 425 are fully engaged. The motor is driven in a way that is controlled.

如此地、本發明由於利用鎖定板鎖定驅動軸,因而能夠容易地分離並更換固定蓋和砂輪。 As such, in the present invention, since the drive shaft is locked by the lock plate, the fixed cover and the grinding wheel can be easily separated and replaced.

而且,本發明由於在鎖定板上形成卡坎並在輪外殼一側設置檢測第一外殼和第二外殼的配合狀態的檢測開關,因此,能夠防止驅動馬達在第一外殼和第二外殼所未 完全配合的狀態下驅動所導致的驅動軸的損傷或故障。 Moreover, the present invention can prevent the drive motor from being in the first outer casing and the second outer casing by forming a hook on the lock plate and providing a detecting switch for detecting the mating state of the first outer casing and the second outer casing on the wheel casing side. Damage or failure of the drive shaft caused by driving in a fully mated state.

通過如上所述的過程,本發明在砂輪的前後左右各側面設置噴嘴和噴射管,從而能夠朝向砂輪和半導體條帶的磨削面而整體上噴射切削液。 According to the above-described process, the present invention provides the nozzle and the injection pipe on the front, rear, left and right sides of the grinding wheel, so that the cutting fluid can be sprayed as a whole toward the grinding wheel and the grinding surface of the semiconductor strip.

以上雖然按照上述實施例而具體說明了由本發明人所完成的發明,但本發明並不限定於上述實施例,當然,本發明在不超出其要旨的範圍內能夠進行各種變更。 The invention made by the inventors of the present invention has been described in detail above. The present invention is not limited to the above-described embodiments, and various modifications can be made without departing from the spirit and scope of the invention.

在上述實施例中,雖然以在輪外殼的兩側分別設置噴嘴並在砂輪的前後側設置噴射管的例子來進行了說明,但本發明未必限定於此。 In the above embodiment, the description has been made on the case where the nozzles are provided on both sides of the wheel casing and the injection pipes are provided on the front and rear sides of the grinding wheel, but the present invention is not necessarily limited thereto.

亦即,本發明還能夠多樣地變更噴嘴和噴射管的設置位置,比如可以僅在輪外殼的一側或兩側設置噴嘴或僅在砂輪的前側或後側設置噴射管。 That is, the present invention can also variously change the arrangement positions of the nozzles and the injection pipes, for example, it is possible to provide nozzles only on one side or both sides of the wheel housing or to provide the injection pipes only on the front side or the rear side of the grinding wheel.

產業利用性 Industrial utilization

本發明適用於將半導體條帶的單位基板上部的模製層磨削而去除的半導體條帶研磨機技術。 The present invention is applicable to a semiconductor strip mill technique in which a mold layer of an upper portion of a unit substrate of a semiconductor strip is ground and removed.

40‧‧‧磨削裝置 40‧‧‧ grinding device

42‧‧‧外殼部 42‧‧‧ Shell

45‧‧‧支撐板 45‧‧‧Support board

46‧‧‧距離檢測感測器 46‧‧‧ Distance detection sensor

70‧‧‧檢測單元 70‧‧‧Detection unit

421‧‧‧輪外殼 421‧‧‧ wheel housing

422‧‧‧罩 422‧‧ hood

423‧‧‧馬達外殼 423‧‧‧Motor housing

424‧‧‧第一外殼 424‧‧‧ first casing

425‧‧‧第二外殼 425‧‧‧ second casing

Claims (10)

一種磨削裝置,包括:驅動馬達;砂輪,其通過該驅動馬達的旋轉而磨削半導體條帶;以及外殼部,其保護該砂輪;該外殼部以在更換該砂輪時使一側樞軸旋轉而能夠敞開的方式形成。 A grinding device comprising: a drive motor; a grinding wheel that grinds the semiconductor strip by rotation of the drive motor; and an outer casing portion that protects the grinding wheel; the outer casing portion pivots one side when the grinding wheel is replaced It can be formed in an open manner. 如請求項1所記載的磨削裝置,其中進一步包括:X軸機器人和Z軸機器人,其使該外殼部分別朝向X軸和Z軸方向移動;支撐板,其連接該外殼部和該Z軸機器人;以及距離檢測感測器,其檢測該砂輪與該半導體條帶之間的距離。 The grinding apparatus according to claim 1, further comprising: an X-axis robot and a Z-axis robot that move the outer casing portion toward the X-axis and the Z-axis direction, respectively; and a support plate that connects the outer casing portion and the Z-axis a robot; and a distance detecting sensor that detects a distance between the grinding wheel and the semiconductor strip. 如請求項2所記載的磨削裝置,其中該外殼部包括:輪外殼,其內部形成有設置該砂輪的空間,且在下表面形成有開口部以使該砂輪突出;罩,其以能夠敞開或封閉該輪外殼的前表面的方式配合;以及馬達外殼,其與該輪外殼的後端部配合且其內部設置驅動馬達;該輪外殼包括第一外殼和第二外殼,該第一外殼和該第二外殼被左右分割以便在更換該砂輪時使一側部樞軸旋轉而能夠敞開,且在配合時形成長方體形 狀。 The grinding device according to claim 2, wherein the outer casing portion includes: a wheel housing having a space in which the grinding wheel is disposed, and an opening portion is formed on the lower surface to protrude the grinding wheel; and the cover is openable or Closing a front surface of the wheel housing; and a motor housing that mates with a rear end portion of the wheel housing and has a drive motor disposed therein; the wheel housing includes a first housing and a second housing, the first housing and the The second outer casing is divided to the left and right so as to be pivotable when the grinding wheel is replaced, and can be opened, and formed into a rectangular parallelepiped shape when mated shape. 如請求項3所記載的磨削裝置,其中在該第一外殼和該第二外殼的下端部內側各自設置有進行磨削作業時向該砂輪噴射切削液的噴嘴。 The grinding apparatus according to claim 3, wherein a nozzle for ejecting the cutting fluid to the grinding wheel during the grinding operation is provided on each of the inner side of the lower end portion of the first outer casing and the second outer casing. 如請求項4所記載的磨削裝置,其中在該第二外殼連接有供給切削液的供給管;在該第二外殼下端設置有一對噴射管,該一對噴射管以該砂輪為中心在前後側僅隔開預定的距離;在該一對噴射管分別形成有噴射切削液的複數個噴射孔。 The grinding apparatus according to claim 4, wherein a supply pipe for supplying cutting fluid is connected to the second casing; and a pair of injection pipes are provided at a lower end of the second casing, the pair of injection pipes being centered on the grinding wheel The sides are separated by a predetermined distance; a plurality of injection holes for jetting the cutting fluid are formed in the pair of injection pipes, respectively. 如請求項3所記載的磨削裝置,其中進一步包括鎖定單元,其設置於該輪外殼,並以防止設置於該驅動馬達的驅動軸的旋轉的方式進行鎖定;該鎖定單元包括:設置於該第一外殼的背面板的鎖定板;以及將該鎖定板能夠水平移動地固定在該第一外殼的固定板。 The grinding apparatus according to claim 3, further comprising a locking unit disposed on the wheel housing and locking in a manner of preventing rotation of a driving shaft provided to the driving motor; the locking unit comprising: a locking plate of the back panel of the first housing; and a fixing plate for fixing the locking panel to the first housing in a horizontally movable manner. 如請求項6所記載的磨削裝置,其中在該鎖定板的中央部形成有配合孔,該配合孔形成為圓形以與該驅動軸的剖面對應;在該配合孔的一側以與該配合孔連通的方式形成有固定孔,該固定孔在上端和下端具有直線部以與在上端和下端形成有相互平行的平面的固定突部的剖面形狀對應,該固定突部設置於該驅動軸的前端部。 The grinding device according to claim 6, wherein a fitting hole is formed in a central portion of the lock plate, the fitting hole being formed in a circular shape to correspond to a cross section of the drive shaft; A fixing hole is formed in a manner of communicating with the hole, and the fixing hole has a straight portion at the upper end and the lower end to correspond to a cross-sectional shape of the fixing protrusion formed at the upper end and the lower end with a plane parallel to each other, the fixing protrusion being disposed on the driving shaft Front end. 如請求項7所記載的磨削裝置,其中在該鎖定板的兩側分別形成有延伸部; 在該延伸部的前端彎折形成有卡坎,該卡坎在該第一外殼和該第二外殼配合時卡定在該第二外殼的內側面而使該鎖定板移動至預定的初始位置。 The grinding device of claim 7, wherein an extension portion is formed on each side of the locking plate; A buckle is formed at a front end of the extending portion, and the yoke is locked to an inner side surface of the second outer casing when the first outer casing and the second outer casing are engaged to move the locking plate to a predetermined initial position. 如請求項3所記載的磨削裝置,其中在該第一外殼設置有檢測該第一外殼和該第二外殼的配合狀態的檢測單元;控制該磨削裝置的驅動的控制部,基於該檢測單元的檢測結果而以僅在該第一外殼和該第二外殼完全配合的狀態下使該驅動馬達驅動的方式進行控制。 The grinding apparatus according to claim 3, wherein the first casing is provided with a detecting unit that detects a fitting state of the first casing and the second casing; and a control unit that controls driving of the grinding device, based on the detecting The detection result of the unit is controlled in such a manner that the drive motor is driven only in a state in which the first outer casing and the second outer casing are fully engaged. 一種磨削裝置所適用的半導體條帶研磨機,包括:磨削裝置,其具有如請求項1至9中任一項所記載的構成,且將半導體條帶的保護模製層磨削而去除;真空吸盤單元,其固定並清洗該半導體條帶;第一拾取器,其將該半導體條帶依次載入於該真空吸盤單元;乾燥單元,其將由該磨削裝置所磨削的該半導體條帶進行乾燥;以及第二拾取器,其將在該磨削裝置所磨削的該半導體條帶載入於該乾燥單元。 A semiconductor strip grinding machine to which a grinding apparatus is applied, comprising: a grinding apparatus having the constitution as recited in any one of claims 1 to 9, and grinding the protective molding layer of the semiconductor strip to remove a vacuum chuck unit that fixes and cleans the semiconductor strip; a first picker that sequentially loads the semiconductor strip to the vacuum chuck unit; a drying unit that will grind the semiconductor strip by the grinding device The belt is dried; and a second picker that loads the semiconductor strip that is ground at the grinding device into the drying unit.
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