TW201610067A - Adhesive film - Google Patents

Adhesive film Download PDF

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TW201610067A
TW201610067A TW104106046A TW104106046A TW201610067A TW 201610067 A TW201610067 A TW 201610067A TW 104106046 A TW104106046 A TW 104106046A TW 104106046 A TW104106046 A TW 104106046A TW 201610067 A TW201610067 A TW 201610067A
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layer
component
resin composition
insulating layer
volume
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TW104106046A
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Chinese (zh)
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TWI653312B (en
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Hideki Oyama
Eiichi Hayashi
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Ajinomoto Kk
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    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J7/00Adhesives in the form of films or foils
    • C09J7/20Adhesives in the form of films or foils characterised by their carriers
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J11/00Features of adhesives not provided for in group C09J9/00, e.g. additives
    • C09J11/02Non-macromolecular additives
    • C09J11/04Non-macromolecular additives inorganic
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J11/00Features of adhesives not provided for in group C09J9/00, e.g. additives
    • C09J11/02Non-macromolecular additives
    • C09J11/06Non-macromolecular additives organic
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J163/00Adhesives based on epoxy resins; Adhesives based on derivatives of epoxy resins
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J9/00Adhesives characterised by their physical nature or the effects produced, e.g. glue sticks
    • C09J9/02Electrically-conducting adhesives
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J2203/00Applications of adhesives in processes or use of adhesives in the form of films or foils
    • C09J2203/326Applications of adhesives in processes or use of adhesives in the form of films or foils for bonding electronic components such as wafers, chips or semiconductors

Abstract

The present invention relates to an adhesive film capable of improving magnetic permeability, reducing a loss of magnetic forces, and forming an insulation layer with excellent reliability on an insulating property. The adhesive film has a supporter and a resin composition layer installed on the supporter. The resin composition layer contains components of (A) a thermosetting resin, (B) a magnetic filler, and (C) an inorganic filler. A content of the component (B) is 10 volume% or more, based on 100 volume% of a nonvolatile component in a resin composition forming the resin composition layer. Moreover, a value obtained by dividing the content of the component (C) by the content of the component (B) is 0.3-3.0.

Description

接著薄膜 Next film

本發明係關於接著薄膜、配線板及配線板之製造方法。 The present invention relates to a method of manufacturing a film, a wiring board, and a wiring board.

功率電感器、高頻帶區域用電感器、稱為共模扼流線圈(common mode choke coil)之電感器元件多數已搭載於行動電話、智慧型手機等之資訊終端。目前,作動訊號之頻率為1GHz以上,尤其是1GHz至3GHz之範圍的高頻帶區域用電感器元件已知有例如於芯構件上捲繞線圈之捲線構造、於芯構件上積層線圈導體之積層構造、於複數之層狀絕緣體各者上形成有構成線圈之一部分之配線層,且將形成配線層之絕緣層彼此以使各配線層彼此電性連接之方式積層而於絕緣部之厚度內擠入線圈之薄膜構造。 A power inductor, a high-band region inductor, and an inductor element called a common mode choke coil are often mounted on information terminals such as mobile phones and smart phones. At present, the inductor element of the high frequency band region in which the frequency of the operation signal is 1 GHz or more, particularly in the range of 1 GHz to 3 GHz, is known, for example, a winding structure in which a coil is wound around a core member, and a laminated structure in which a coil conductor is laminated on a core member. A wiring layer constituting one of the coils is formed on each of the plurality of layered insulators, and the insulating layers forming the wiring layer are laminated in such a manner that the wiring layers are electrically connected to each other to be squeezed into the thickness of the insulating portion. The film construction of the coil.

高頻帶區域用電感器元件中,由於作為特性要求高的Q值,故一般採用空芯線圈,亦即芯部為中空,或填充非磁性體之構造。然而,此種構造之高頻帶區域用電感器元件不可能提高芯部為非磁性之芯部的磁導率(比 磁導率),故若使電感器元件更小型化,則在高頻帶區域作動時會有電感係數(L值)下降之缺點。 In the inductor element for a high-frequency band region, since the Q value is required to be high in characteristics, an air-core coil is generally used, that is, a structure in which the core portion is hollow or filled with a non-magnetic material. However, it is impossible for the high-frequency band region of such a configuration to increase the magnetic permeability of the non-magnetic core portion of the core (in comparison) Since the magnetic permeability is increased, the inductor element is further reduced in size, and the inductance (L value) is lowered when the high frequency band region is activated.

專利文獻1中揭示若使用含有(A)具有羧基之脂環式烯烴聚合物、(B)熱硬化劑、(C)磁性體、及(D)溶劑之熱硬化性磁性漿料,則(C)磁性體之分散性優異,可以高濃度含有各成分,可形成電絕緣性、高頻特性、磁導率等特性優異之電絕緣層。 Patent Document 1 discloses that when a thermosetting magnetic slurry containing (A) an alicyclic olefin polymer having a carboxyl group, (B) a thermosetting agent, (C) a magnetic material, and (D) a solvent is used, (C) The magnetic material is excellent in dispersibility, and can contain various components at a high concentration, and can form an electrically insulating layer having excellent properties such as electrical insulating properties, high-frequency characteristics, and magnetic permeability.

[先前技術文獻] [Previous Technical Literature] [專利文獻] [Patent Literature]

[專利文獻1]國際公開第2004/29153號 [Patent Document 1] International Publication No. 2004/29153

近年來因如資訊終端之進而薄型化、小型化之要求,高頻帶區域用電感器元件亦被要求薄型化、小型化。 In recent years, in order to reduce the size and size of information terminals, the inductor elements for high-band regions have also been required to be thinner and smaller.

為了使高頻帶區域用電感器元件之進一步薄型化、小型化,而需要減少線圈匝數,且使構成線圈之配線之剖面積變小。為了減少線圈匝數,使構成線圈之配線之剖面積變小時,前述薄膜構造之高頻帶區域用電感器元件較有利。但,薄膜構造之高頻帶區域用電感器元件僅單純減少線圈匝數,使構成線圈之配線之剖面積變小時,電感器會降低。薄膜構造之高頻帶區域用電感器元件若可提 高絕緣層之磁導率(μ’),則可提高高頻帶區域用電感器元件之L值及Q值。因此,要求可進一步提高絕緣層之磁導率,且可減低磁性損失之材料。 In order to further reduce the thickness and size of the inductor element in the high-frequency band region, it is necessary to reduce the number of turns of the coil and to reduce the cross-sectional area of the wiring constituting the coil. In order to reduce the number of turns of the coil and to reduce the sectional area of the wiring constituting the coil, the inductor element of the high-frequency band region of the film structure is advantageous. However, in the inductor element of the high-frequency band region of the film structure, only the number of turns of the coil is simply reduced, and the cross-sectional area of the wiring constituting the coil is made small, and the inductor is lowered. Inductor components for high-band regions of thin film construction The magnetic permeability (μ') of the high insulating layer can increase the L value and the Q value of the inductor element for the high frequency band region. Therefore, it is required to further increase the magnetic permeability of the insulating layer and to reduce the magnetic loss of the material.

然而,前述專利文獻1中使用該熱硬化性磁性漿料形成薄膜構造之電感器元件時,會有尤其在頻率為1GHz至3GHz之範圍的磁性損失(μ”)變大之虞。因此,專利文獻1所揭示之材料難稱為可使用作為高頻帶區域用電感器元件之絕緣層(絕緣部)之材料。 However, in the above-described Patent Document 1, when the thermosetting magnetic slurry is used to form an inductor element having a thin film structure, the magnetic loss (μ") particularly in the range of 1 GHz to 3 GHz is increased. The material disclosed in Document 1 is hardly referred to as a material which can be used as an insulating layer (insulating portion) of an inductor element for a high-frequency band region.

本發明人等為了根據如前述之要求而針對包含磁性填料之樹脂組成物進行積極檢討,獲得之見解為樹脂組成物包含磁性填料,使用該樹脂組成物形成絕緣層時,存在有在頻率為1GHz至3GHz之範圍內磁性損失變大,且Q值下降,進而絕緣性之信賴性下降之問題點。 The inventors of the present invention have conducted a preliminary review on a resin composition containing a magnetic filler in accordance with the above-mentioned requirements, and have found that the resin composition contains a magnetic filler, and when the resin composition is used to form an insulating layer, there is a frequency of 1 GHz. In the range of up to 3 GHz, the magnetic loss is increased, and the Q value is lowered, and the reliability of insulation is lowered.

本發明係鑑於前述問題點而完成者,其目的係提供接著薄膜,其使用可提高頻率為1GHz至3GHz之範圍內之磁導率、可減低磁性損失、且可形成絕緣性之信賴性優異之絕緣層之樹脂組成物,以及提供使用該接著薄膜之配線板及配線板之製造方法。 The present invention has been made in view of the above problems, and an object thereof is to provide a bonding film which can improve magnetic permeability in a frequency range of 1 GHz to 3 GHz, can reduce magnetic loss, and is excellent in reliability in forming insulation. A resin composition of an insulating layer, and a method of manufacturing a wiring board and a wiring board using the bonding film.

本發明提供下述[1]~[20]。 The present invention provides the following [1] to [20].

[1]一種接著薄膜,其係具有支撐體與設於該支撐體上之樹脂組成物層之接著薄膜,其中前述樹脂組成物層含有成分(A)熱硬化性樹脂、成分 (B)磁性填料、及成分(C)無機填充材,且將構成前述樹脂組成物層之樹脂組成物中之不揮發成分設為100體積%時,成分(B)之含量為10體積%以上,且成分(C)之含量除以成分(B)之含量之值為0.3~3.0之範圍。 [1] An adhesive film comprising a support and a resin composition layer provided on the support, wherein the resin composition layer contains a component (A) a thermosetting resin, a component. (B) Magnetic filler and component (C) inorganic filler, and when the nonvolatile content in the resin composition constituting the resin composition layer is 100% by volume, the content of the component (B) is 10% by volume or more. And the content of the component (C) divided by the content of the component (B) is in the range of 0.3 to 3.0.

[2]如[1]所記載之接著薄膜,其中成分(A)為環氧樹脂,前述樹脂組成物進而含有選自酚系硬化劑及萘酚系硬化劑之環氧樹脂硬化劑。 [2] The adhesive film according to [1], wherein the component (A) is an epoxy resin, and the resin composition further contains an epoxy resin curing agent selected from the group consisting of a phenolic curing agent and a naphthol-based curing agent.

[3]如[2]所記載之接著薄膜,其中環氧樹脂硬化劑係選自含三嗪骨架之甲酚系硬化劑及含三嗪骨架之酚系硬化劑。 [3] The adhesive film according to [2], wherein the epoxy resin hardener is selected from the group consisting of a cresol-based hardener containing a triazine skeleton and a phenolic hardener containing a triazine skeleton.

[4]如[1]~[3]中任一項所記載之接著薄膜,其中前述樹脂組成物進而含有熱可塑性樹脂。 [4] The adhesive film according to any one of [1] to [3] wherein the resin composition further contains a thermoplastic resin.

[5]如[1]~[4]中任一項所記載之接著薄膜,其中前述樹脂組成物中,成分(B)之含量為10體積%~40體積%,且成分(C)之含量為10體積%~50體積%。 [5] The adhesive film according to any one of [1] to [4] wherein the content of the component (B) in the resin composition is from 10% by volume to 40% by volume, and the content of the component (C) It is 10% by volume to 50% by volume.

[6]如[1]~[5]中任一項所記載之接著薄膜,其中前述樹脂組成物中,成分(B)與成分(C)之含量合計為20體積%~75體積%。 [6] The adhesive film according to any one of [1], wherein the content of the component (B) and the component (C) in the resin composition is 20% by volume to 75% by volume in total.

[7]如[1]~[6]中任一項所記載之接著薄膜,其中前述樹脂組成物中,成分(B)之含量為10體積%~25體積%。 [7] The adhesive film according to any one of [1] to [6] wherein the content of the component (B) in the resin composition is from 10% by volume to 25% by volume.

[8]如[1]~[7]中任一項所記載之接著薄膜,其中前述樹脂組成物中,成分(B)之含量為20體積%~25體積%,成分(C)之含量為10體積%~25體積%,且成分(B)與成分(C) 之含量合計為30體積%~50體積%。 [8] The adhesive film according to any one of [1], wherein the content of the component (B) in the resin composition is 20% by volume to 25% by volume, and the content of the component (C) is 10% by volume to 25% by volume, and component (B) and component (C) The total content is 30% by volume to 50% by volume.

[9]如[1]~[8]中任一項所記載之接著薄膜,其中前述樹脂組成物中,成分(B)之平均粒徑為0.3μm~10μm。 [9] The adhesive film according to any one of [1] to [8] wherein the component (B) has an average particle diameter of 0.3 μm to 10 μm in the resin composition.

[10]如[1]~[9]中任一項所記載之接著薄膜,其中成分(C)之平均粒徑為0.01μm~5μm。 [10] The adhesive film according to any one of [1] to [9] wherein the component (C) has an average particle diameter of from 0.01 μm to 5 μm.

[11]如[1]~[10]中任一項所記載之接著薄膜,其中成分(B)之平均粒徑大於成分(C)之平均粒徑。 [11] The adhesive film according to any one of [1] to [10] wherein the average particle diameter of the component (B) is larger than the average particle diameter of the component (C).

[12]如[1]~[11]中任一項所記載之接著薄膜,其中成分(C)為二氧化矽。 [12] The adhesive film according to any one of [1] to [11] wherein the component (C) is cerium oxide.

[13]如[1]~[12]中任一項所記載之接著薄膜,其中成分(C)係經表面處理劑處理之二氧化矽。 [13] The adhesive film according to any one of [1] to [12] wherein the component (C) is a cerium oxide treated with a surface treating agent.

[14]如[13]所記載之接著薄膜,其中表面處理劑為胺基矽烷系偶合劑。 [14] The adhesive film according to [13], wherein the surface treatment agent is an amino decane-based coupling agent.

[15]如[1]~[14]中任一項所記載之接著薄膜,其中作成硬化物時,於頻率為1GHz至3GHz時之磁導率為1.1以上,且於頻率為1GHz至3GHz時之磁性損失為0.5以下。 [15] The adhesive film according to any one of [1] to [14] wherein, when the cured product is formed, the magnetic permeability is 1.1 or more at a frequency of 1 GHz to 3 GHz, and the frequency is 1 GHz to 3 GHz. The magnetic loss is 0.5 or less.

[16]如[1]~[15]中任一項所記載之接著薄膜,其中作成硬化物時,於頻率為1GHz至3GHz時之磁導率為1.2以上,且於頻率為1GHz至3GHz時之磁性損失為0.3以下。 [16] The adhesive film according to any one of [1] to [15] wherein, when the cured product is formed, the magnetic permeability is 1.2 or more at a frequency of 1 GHz to 3 GHz, and the frequency is 1 GHz to 3 GHz. The magnetic loss is 0.3 or less.

[17]如[1]~[16]中任一項所記載之接著薄膜,其係用於形成具備電感器元件之配線板的絕緣層。 [17] The adhesive film according to any one of [1] to [16], which is used for forming an insulating layer of a wiring board including an inductor element.

[18]一種配線板,其具有如[1]~[16]中任一項所記載 之接著薄膜之樹脂組成物層的硬化物之絕緣層,與至少一部分埋入該絕緣層中之線圈狀導電性構造體,且包含電感器元件,其係由前述線圈狀導電性構造體與於前述絕緣層之厚度方向延伸且由前述線圈狀導電性構造體所包圍之前述絕緣層中之一部分所構成。 [18] A wiring board having the same as any one of [1] to [16] An insulating layer of a cured product of the resin composition layer of the film, and a coil-shaped conductive structure in which at least a portion of the insulating layer is embedded, and an inductor element including the coil-shaped conductive structure The insulating layer extends in the thickness direction and is composed of one of the insulating layers surrounded by the coil-shaped conductive structure.

[19]如[18]所記載之配線板,其中前述電感器元件發揮功能之頻率為1GHz以上。 [19] The wiring board according to [18], wherein the frequency at which the inductor element functions is 1 GHz or more.

[20]一種配線板之製造方法,該配線板係具有含有第1絕緣層及第2絕緣層之絕緣部、與至少一部分埋入該絕緣部中之線圈狀導電性構造體,且包含由該線圈狀導電性構造體與前述絕緣部中之一部分構成之電感器元件,該製造方法包含下列步驟:準備如[1]~[16]中任一項所記載之接著薄膜、及設有第1配線層之芯基材之步驟,將前述接著薄膜之樹脂組成物層層合於前述芯基材上之步驟,使前述樹脂組成物層熱硬化而形成第1絕緣層之步驟,於前述第1絕緣層上形成通孔之步驟,對形成有前述通孔之前述第1絕緣層進行粗化處理之步驟,於前述第1絕緣層上形成第2配線層,且形成使前述第1配線層與前述第2配線層電性連接之通孔內配線之步驟, 進而將前述接著薄膜層合於形成有前述第2配線層及前述通孔內配線之前述第1絕緣層上,並經熱硬化而形成前述第2絕緣層之步驟,形成包含含有前述第1配線層之一部分與前述第2配線層之一部分與前述通孔內配線之線圈狀導電性構造體、及朝前述絕緣部之厚度方向延伸且由前述線圈狀導電性構造體包圍之前述絕緣部之一部分之前述電感器元件之步驟。 [20] A method of manufacturing a wiring board, comprising: an insulating portion including a first insulating layer and a second insulating layer; and a coil-shaped conductive structure in which at least a portion is embedded in the insulating portion, and including An inductor element comprising a coil-shaped conductive structure and a part of the insulating portion, the manufacturing method comprising the steps of: preparing the adhesive film according to any one of [1] to [16], and providing the first a step of forming a core substrate of the wiring layer, a step of laminating the resin composition layer of the adhesive film on the core substrate, and thermally curing the resin composition layer to form a first insulating layer, in the first step a step of forming a via hole in the insulating layer, and performing a roughening treatment on the first insulating layer on which the via hole is formed, forming a second wiring layer on the first insulating layer, and forming the first wiring layer and a step of wiring the through holes in the second wiring layer electrically connected, Further, the adhesive film is laminated on the first insulating layer on which the second wiring layer and the via wiring are formed, and is thermally cured to form the second insulating layer, and the first wiring is formed to include the first wiring a coil-shaped conductive structure in which one of the layers and one of the second wiring layers and the wiring in the through-hole are formed, and a portion of the insulating portion that extends in the thickness direction of the insulating portion and is surrounded by the coil-shaped conductive structure The steps of the aforementioned inductor element.

若使用本發明之接著薄膜,則可提高尤其頻率為1GHz至3GHz之範圍之磁導率、可降低磁性損失,且可提供絕緣性之信賴性優異之絕緣層,進而可藉由簡易之步驟而提供擠入有包含該絕緣層之高性能高頻帶區域用電感器元件之配線板。 When the adhesive film of the present invention is used, the magnetic permeability particularly in the range of 1 GHz to 3 GHz can be improved, the magnetic loss can be reduced, and the insulating layer excellent in insulation reliability can be provided, and the simple steps can be A wiring board in which an inductor element for a high-performance high-frequency band region including the insulating layer is extruded is provided.

10‧‧‧配線板 10‧‧‧ wiring board

20‧‧‧芯基材(內層電路基板) 20‧‧‧ core substrate (inner circuit board)

20a‧‧‧第1主表面 20a‧‧‧1st main surface

20b‧‧‧第2主表面 20b‧‧‧2nd main surface

22‧‧‧貫穿孔 22‧‧‧through holes

22a‧‧‧貫穿孔內配線 22a‧‧‧Wiring in the through hole

24‧‧‧外部端子 24‧‧‧External terminals

30‧‧‧絕緣部 30‧‧‧Insulation

32‧‧‧第1絕緣層 32‧‧‧1st insulation layer

34‧‧‧第2絕緣層 34‧‧‧2nd insulation layer

36‧‧‧通孔 36‧‧‧through hole

36a‧‧‧通孔內配線 36a‧‧‧Through wiring

40‧‧‧線圈狀導電性構造體 40‧‧‧Circular conductive structure

42‧‧‧第1配線層 42‧‧‧1st wiring layer

42a‧‧‧焊墊 42a‧‧‧ solder pads

44‧‧‧第2配線層 44‧‧‧2nd wiring layer

圖1係自厚度方向之一側觀看配線板之示意俯視圖。 Fig. 1 is a schematic plan view of the wiring board viewed from one side in the thickness direction.

圖2係示意地顯示在以II-II一點鏈線所示之位置切斷之配線板之切斷端面。 Fig. 2 is a view schematically showing a cut end face of a wiring board cut at a position indicated by a point chain of II-II.

圖3係用於說明配線板中之第1配線層之構成之示意俯視圖。 3 is a schematic plan view for explaining a configuration of a first wiring layer in a wiring board.

以下,參照圖式,針對本發明之實施形態加以說明。又,各圖式不過是基於可理解發明之程度,概略顯示構成要素之形狀、大小及配置。本發明並不因以下之描述而受限,各構成要素可在不脫離本發明要旨之範圍內進行適當變更。以下說明所使用之圖式針對相同構成要素係賦予相同符號表示,而有省略重複說明之情況。又,本發明之實施形態中不限定於該構成必定依圖示例之配置而製造、使用。 Hereinafter, embodiments of the present invention will be described with reference to the drawings. Moreover, each drawing is a schematic view showing the shape, size, and arrangement of the constituent elements based on the extent to which the invention can be understood. The present invention is not limited by the following description, and various constituent elements can be appropriately modified without departing from the scope of the invention. In the following description, the same components are denoted by the same reference numerals, and the description thereof will not be repeated. Further, the embodiment of the present invention is not limited to the configuration and is manufactured and used in accordance with the configuration of the example.

首先針對本實施形態之接著薄膜所用之樹脂組成物加以說明。 First, the resin composition used for the film of the present embodiment will be described.

樹脂組成物係含有成分(A)熱硬化性樹脂、成分(B)磁性填料、及成分(C)無機填充材之樹脂組成物,將樹脂組成物中之不揮發成分設為100體積%時,成分(B)之含量為10體積%以上,且成分(C)之含量除以成分(B)之含量之值為0.3~3.0之範圍。 The resin composition contains the resin composition of the component (A) thermosetting resin, the component (B) magnetic filler, and the component (C) inorganic filler, and when the nonvolatile content in the resin composition is 100% by volume, The content of the component (B) is 10% by volume or more, and the content of the component (C) divided by the content of the component (B) is in the range of 0.3 to 3.0.

以下,針對樹脂組成物可含有之成分具體說明。 Hereinafter, the components which can be contained in the resin composition will be specifically described.

(成分(A)) (ingredient (A))

樹脂組成物含有熱硬化性樹脂作為成分(A)。熱硬化性樹脂之例列舉為環氧樹脂 The resin composition contains a thermosetting resin as the component (A). Examples of thermosetting resins are exemplified as epoxy resins.

-環氧樹脂- - epoxy resin -

環氧樹脂列舉為例如雙酚A型環氧樹脂、雙酚F型 環氧樹脂、雙酚S型環氧樹脂、雙酚AF型環氧樹脂、二環戊二烯型環氧樹脂、三酚環氧樹脂、萘酚酚醛清漆環氧樹脂、酚酚醛清漆型環氧樹脂、第三丁基兒茶酚型環氧樹脂、萘型環氧樹脂、萘酚型環氧樹脂、蒽型環氧樹脂、縮水甘油胺型環氧樹脂、縮水甘油酯型環氧樹脂、甲酚酚醛清漆型環氧樹脂、聯苯型環氧樹脂、線狀脂肪族環氧樹脂、具有丁二烯構造之環氧樹脂、脂環式環氧樹脂、雜環式環氧樹脂、含有螺環之環氧樹脂、環己烷二甲醇型環氧樹脂、萘醚型環氧樹脂及三羥甲基型環氧樹脂等。環氧樹脂可單獨使用1種,或亦可併用2種以上。 The epoxy resin is exemplified by, for example, bisphenol A type epoxy resin and bisphenol F type. Epoxy resin, bisphenol S type epoxy resin, bisphenol AF type epoxy resin, dicyclopentadiene type epoxy resin, trisphenol epoxy resin, naphthol novolac epoxy resin, phenol novolac type epoxy Resin, t-butyl catechol epoxy resin, naphthalene epoxy resin, naphthol epoxy resin, fluorene epoxy resin, glycidylamine epoxy resin, glycidyl ester epoxy resin, Phenolic novolak type epoxy resin, biphenyl type epoxy resin, linear aliphatic epoxy resin, epoxy resin having butadiene structure, alicyclic epoxy resin, heterocyclic epoxy resin, and spiro ring Epoxy resin, cyclohexane dimethanol type epoxy resin, naphthalene ether type epoxy resin and trimethylol type epoxy resin. Epoxy resins may be used alone or in combination of two or more.

環氧樹脂較好含有1分子中具有2個以上環氧基之環氧樹脂。將環氧樹脂之不揮發成分設為100質量%時,較好至少50質量%以上為1分子中具有2個以上環氧基之環氧樹脂。其中,較好含有1分子中具有2個以上環氧基、在溫度20℃下為液狀之環氧樹脂(以下,稱為「液狀環氧樹脂」),與1分子中具有3個以上環氧基、在溫度20℃下為固體狀之環氧樹脂(以下,稱為「固體狀環氧樹脂」)。藉由併用液狀環氧樹脂與固體狀環氧樹脂作為環氧樹脂,可獲得優異之可撓性。 The epoxy resin preferably contains an epoxy resin having two or more epoxy groups in one molecule. When the non-volatile component of the epoxy resin is 100% by mass, it is preferably at least 50% by mass or more of an epoxy resin having two or more epoxy groups in one molecule. In particular, an epoxy resin having two or more epoxy groups in one molecule and a liquid at a temperature of 20 ° C (hereinafter referred to as "liquid epoxy resin") is preferably contained, and three or more molecules are contained in one molecule. An epoxy group or an epoxy resin which is solid at a temperature of 20 ° C (hereinafter referred to as "solid epoxy resin"). Excellent flexibility can be obtained by using a liquid epoxy resin together with a solid epoxy resin as an epoxy resin.

液狀環氧樹脂列舉為例如雙酚A型環氧樹脂、雙酚F型環氧樹脂、酚酚醛清漆型環氧樹脂、2官能脂肪族環氧樹脂、或萘型環氧樹脂,較好為雙酚A型環氧樹脂、雙酚F型環氧樹脂、或萘型環氧樹脂。液狀環氧樹脂之具體例列舉為DIC(股)製之「HP4032」、 「HP4032D」、「HP4032SS」(萘型環氧樹脂)、三菱化學(股)製之「jER828EL」、「jER1007」(雙酚A型環氧樹脂)、「jER807」(雙酚F型環氧樹脂)、「jER152」(酚酚醛清漆型環氧樹脂)、新日鐵化學(股)製之「ZX1059」(雙酚A型環氧樹脂與雙酚F型環氧樹脂之混合品)、「YL7410」(2官能脂肪族環氧樹脂)等。該等可單獨使用1種,或亦可併用2種以上。 The liquid epoxy resin is exemplified by, for example, a bisphenol A type epoxy resin, a bisphenol F type epoxy resin, a phenol novolak type epoxy resin, a bifunctional aliphatic epoxy resin, or a naphthalene type epoxy resin, preferably Bisphenol A type epoxy resin, bisphenol F type epoxy resin, or naphthalene type epoxy resin. Specific examples of the liquid epoxy resin are "HP4032" manufactured by DIC Co., Ltd. "HP4032D", "HP4032SS" (naphthalene epoxy resin), "jER828EL" manufactured by Mitsubishi Chemical Corporation, "jER1007" (bisphenol A epoxy resin), "jER807" (bisphenol F epoxy resin) ), "jER152" (phenol novolak type epoxy resin), "ZX1059" manufactured by Nippon Steel Chemical Co., Ltd. (a mixture of bisphenol A epoxy resin and bisphenol F epoxy resin), "YL7410" (2-functional aliphatic epoxy resin) and the like. These may be used alone or in combination of two or more.

固體狀環氧樹脂列舉為例如結晶性2官能環氧樹脂、4官能萘型環氧樹脂、甲酚酚醛清漆型環氧樹脂、二環戊二烯型環氧樹脂、三酚環氧樹脂、萘酚酚醛清漆型環氧樹脂、聯苯型環氧樹脂、萘醚型環氧樹脂。固體狀環氧樹脂之具體例列舉為DIC(股)製之「HP-4700」、「HP-4710」(4官能萘型環氧樹脂)、「N-690」(甲酚酚醛清漆型環氧樹脂)、「N-695」(甲酚酚醛清漆型環氧樹脂)、「HP-7200」(二環戊二烯型環氧樹脂)、「EXA7311」、「EXA7311-G3」、「HP-6000」(萘醚型環氧樹脂)、日本化藥(股)製之「EPPN-502H」(三酚環氧樹脂)、「NC7000L」(萘酚酚醛清漆樹脂)、「NC3000」、「NC3000H」、「NC3000L」、「NC3100」(聯苯型環氧樹脂)、新日鐵化學(股)製之「ESN475」(萘酚酚醛清漆型環氧樹脂)、「ESN485」(萘酚酚醛清漆型環氧樹脂)、三菱化學(股)製之「YX4000H」、「YL6121」(聯苯型環氧樹脂)、結晶性2官能環氧樹脂之「YX4000HK」(聯二甲酚型環氧樹脂) 等。 The solid epoxy resin is exemplified by, for example, a crystalline bifunctional epoxy resin, a tetrafunctional naphthalene epoxy resin, a cresol novolac epoxy resin, a dicyclopentadiene epoxy resin, a trisphenol epoxy resin, and naphthalene. Phenolic novolak type epoxy resin, biphenyl type epoxy resin, naphthalene ether type epoxy resin. Specific examples of the solid epoxy resin are "HP-4700", "HP-4710" (4-functional naphthalene type epoxy resin), and "N-690" ("phenol novolac type epoxy" manufactured by DIC Co., Ltd. Resin), "N-695" (cresol novolac type epoxy resin), "HP-7200" (dicyclopentadiene type epoxy resin), "EXA7311", "EXA7311-G3", "HP-6000" "(Nexene ether type epoxy resin), "EPPN-502H" (trisphenol epoxy resin) made by Nippon Kayaku Co., Ltd., "NC7000L" (naphthol novolac resin), "NC3000", "NC3000H", "NC3000L", "NC3100" (biphenyl type epoxy resin), "ESN475" (naphthol novolac type epoxy resin) manufactured by Nippon Steel Chemical Co., Ltd., "ESN485" (naphthol novolac type epoxy) "YX4000H" (Lyrene-based epoxy resin) made of Mitsubishi Chemical Co., Ltd., "YL6121" (biphenyl type epoxy resin), and crystalline 2-functional epoxy resin (YX4000HK) Wait.

併用液狀環氧樹脂與固體狀環氧樹脂作為環氧樹脂時,該等之量比(液狀環氧樹脂:固體狀環氧樹脂)以質量比計,較好為1:0.1~1:4之範圍。藉由使液狀環氧樹脂與固體狀環氧樹脂之量比成為該範圍,能獲得可獲得具有充分破裂強度之硬化物等之效果。基於該效果之觀點,液狀環氧樹脂與固體狀環氧樹脂之量比(液狀環氧樹脂:固體狀環氧樹脂)以質量比計,較好為1:0.3~1:3.5之範圍,更好為1:0.6~1:3之範圍,又更好為1:0.8~1:2.5之範圍。 When the liquid epoxy resin and the solid epoxy resin are used as the epoxy resin, the ratio (liquid epoxy resin: solid epoxy resin) is preferably 1:0.1 to 1: by mass ratio. 4 range. When the ratio of the amount of the liquid epoxy resin to the solid epoxy resin is within this range, an effect of obtaining a cured product having sufficient fracture strength or the like can be obtained. From the viewpoint of the effect, the ratio of the liquid epoxy resin to the solid epoxy resin (liquid epoxy resin: solid epoxy resin) is preferably in the range of 1:0.3 to 1:3.5 by mass ratio. It is preferably in the range of 1:0.6 to 1:3, and more preferably in the range of 1:0.8 to 1:2.5.

以樹脂組成物中之環氧樹脂之不揮發成分換算之含量較好為20體積%~60體積%,更好為22體積%~55體積%,又更好為24體積%~53體積%,最好為26體積%~49體積%。 The content of the non-volatile component of the epoxy resin in the resin composition is preferably from 20% by volume to 60% by volume, more preferably from 22% by volume to 55% by volume, still more preferably from 24% by volume to 53% by volume, It is preferably from 26% by volume to 49% by volume.

環氧樹脂之環氧當量較好為50~3000之範圍,更好為80~2000之範圍,又更好為110~1000之範圍。藉由設為該範圍,可獲得交聯密度充分之硬化物。又,環氧當量可依據以JIS K7236而規格化之方法測定。此處所謂環氧當量為含有1當量環氧基之環氧樹脂之質量。 The epoxy equivalent of the epoxy resin is preferably in the range of 50 to 3,000, more preferably in the range of 80 to 2,000, and more preferably in the range of 110 to 1,000. By setting it as this range, the cured material with sufficient bridge|crosslinking density can be obtained. Further, the epoxy equivalent can be measured by a method standardized by JIS K7236. Here, the epoxy equivalent is the mass of the epoxy resin containing 1 equivalent of an epoxy group.

(成分(B)) (ingredient (B)) -磁性填料- -Magnetic filler -

樹脂組成物含有磁性填料作為成分(B)。可使用之磁 性填料之材料並無特別限制,列舉為例如純鐵粉末、Fe-Si系合金粉末、Fe-Si-Al系合金粉末、Fe-Ni系合金粉末、Fe-Ni-Mo系合金粉末、Fe-Ni-Mo-Cu系合金粉末、Fe-Co系合金粉末、Fe-Ni-Co系合金粉末、Fe-Cr系合金粉末、Fe-Cr-Si系合金粉末、Fe-Ni-Cr系合金粉末、或Fe-Cr-Al系合金粉末等Fe合金類,Fe基無定型、Co基無定型等無定型合金類、Mg-Zn系肥粒鐵、Mn-Zn系肥粒鐵、Mn-Mg系肥粒鐵、Cu-Zn系肥粒鐵、Mg-Mn-Sr系肥粒鐵、Ni-Zn系肥粒鐵等尖晶石型肥粒鐵類,Ba-Zn系肥粒鐵、Ba-Mg系肥粒鐵、Ba-Ni系肥粒鐵、Ba-Co系肥粒鐵、Ba-Ni-Co系肥粒鐵等六方晶型肥粒鐵類、Y系肥粒鐵等石榴石型肥粒鐵類。 The resin composition contains a magnetic filler as the component (B). Available magnetic The material of the filler is not particularly limited, and examples thereof include pure iron powder, Fe-Si alloy powder, Fe-Si-Al alloy powder, Fe-Ni alloy powder, Fe-Ni-Mo alloy powder, Fe-. Ni-Mo-Cu alloy powder, Fe-Co alloy powder, Fe-Ni-Co alloy powder, Fe-Cr alloy powder, Fe-Cr-Si alloy powder, Fe-Ni-Cr alloy powder, Or Fe alloys such as Fe-Cr-Al alloy powders, amorphous alloys such as Fe-based amorphous and Co-based amorphous, Mg-Zn ferrite, Mn-Zn ferrite, and Mn-Mg fertilizer. Grain iron, Cu-Zn ferrite, Mg-Mn-Sr ferrite, Ni-Zn ferrite, and other spinel ferrites, Ba-Zn ferrite, Ba-Mg Ferritic iron, Ba-Ni ferrite, Ba-Co ferrite, Ba-Ni-Co ferrite, etc., hexagonal crystal ferrite, Y ferrite, iron, etc. class.

磁性填料可使用市售之磁性填料。可使用之市售磁性填料之具體例列舉為山陽特殊製鋼(股)製之「PST-S」、EPSOM ATMIX(股)製之「AW2-08PF20F」、「AW2-08PF10F」、「AW2-08PF3F」、「Fe-3.5Si-4.5CrPF20F」、「Fe-50NiPF20F」、「Fe-80Ni-4MoPF20F」、JFE化學(股)製之「LD-M」、「LD-MH」、「KNI-106」、「KNI-106GSM」、「KNI-106GS」、「KNI-109」、「KNI-109GSM」、「KNI-109GS」、戶田工業(股)製之「KNS-415」、「BSF-547」、「BSF-029」、「BSN-125」、「BSN-714」、「BSN-828」、「S-1281」、「S-1641」、「S-1651」、「S-1470」、「S-1511」、「S-2430」、日本重化學工業(股)製之「JR09P2」、CIK Nanotek(股)製之「Nanotek」、KINSEI MATEC(股)製之「JEMK-S」、「JEMK-H」、ALDRICH公司製之「Yttrium iron oxide」。磁性填料可單獨使用1種,或亦可併用2種以上。 As the magnetic filler, a commercially available magnetic filler can be used. Specific examples of commercially available magnetic fillers that can be used are "PST-S" manufactured by Sanyo Special Steel Co., Ltd., "AW2-08PF20F" manufactured by EPSOM ATMIX, "AW2-08PF10F", and "AW2-08PF3F". "Fe-3.5Si-4.5CrPF20F", "Fe-50NiPF20F", "Fe-80Ni-4MoPF20F", "LD-M", "LD-MH", "KNI-106" made by JFE Chemical Co., Ltd. "KNI-106GSM", "KNI-106GS", "KNI-109", "KNI-109GSM", "KNI-109GS", "KNS-415" and "BSF-547" made by Toda Industrial Co., Ltd. BSF-029, BSN-125, BSN-714, BSN-828, S-1281, S-1641, S-1651, S-1470, S -1511", "S-2430", "JR09P2" made by Japan Heavy Chemical Industry Co., Ltd., CIK "Nanotek" manufactured by Nanotek Co., Ltd., "JEMK-S" manufactured by KINSEI MATEC Co., Ltd., "JEMK-H", and "Yttrium iron oxide" manufactured by ALDRICH. The magnetic filler may be used singly or in combination of two or more.

磁性填料之平均粒徑為0.3μm~10μm以下,較好為0.3μm~7μm之範圍,更好為0.5μm~5μm之範圍。 The average particle diameter of the magnetic filler is from 0.3 μm to 10 μm, preferably from 0.3 μm to 7 μm, more preferably from 0.5 μm to 5 μm.

將樹脂組成物中之不揮發成分設為100體積%時,磁性填料之含量為10體積%以上,較好為10體積%~40體積%,更好為10體積%~35體積%,又更好為15體積%~30體積%,最好為15體積%~25體積%。 When the nonvolatile content in the resin composition is 100% by volume, the content of the magnetic filler is 10% by volume or more, preferably 10% by volume to 40% by volume, more preferably 10% by volume to 35% by volume, and still more It is preferably from 15% by volume to 30% by volume, preferably from 15% by volume to 25% by volume.

(成分(C)) (ingredient (C)) -無機填充材- -Inorganic filler -

樹脂組成物含有無機填充材作為成分(C)。無機填充材通常係為了抑制樹脂組成物硬化時因熱膨脹率降低之熱膨脹率差所致之龜裂、電路變形等異常發生,且抑制熔融黏度過度降低所使用者。且使用磁性填料時,基於以提高磁導率等特性為優先之觀點通常不共存無機填充材。然而,基於防止樹脂組成物中、或藉由使該樹脂組成物硬化形成之硬化物(絕緣層)中之磁性填料凝聚,提高樹脂組成物作成硬化物時之絕緣性之信賴性為目的,而可使用無機填充材。 The resin composition contains an inorganic filler as the component (C). The inorganic filler is usually used to suppress abnormality such as cracks and circuit deformation due to a difference in thermal expansion rate due to a decrease in thermal expansion coefficient when the resin composition is cured, and to suppress excessive decrease in melt viscosity. Further, when a magnetic filler is used, an inorganic filler is not usually coexisted based on the viewpoint of improving characteristics such as magnetic permeability. However, it is aimed at preventing the resin composition in the resin composition or by agglomerating the magnetic filler in the cured product (insulating layer) formed by curing the resin composition, thereby improving the reliability of the insulating property of the resin composition when it is used as a cured product. Inorganic filler materials can be used.

無機填充材列舉為例如二氧化矽、氧化鋁、硫酸鋇、滑石、黏土、雲母粉、氫氧化鋁、氫氧化鎂、碳 酸鈣、碳酸鎂、氧化鎂、氮化硼、硼酸鋁、鈦酸鋇、鈦酸鍶、鈦酸鈣、鈦酸鎂、鈦酸鉍、氧化鈦、鋯酸鋇、及鋯酸鈣等。該等中以無定型二氧化矽、熔融二氧化矽、結晶二氧化矽、合成二氧化矽、中空二氧化矽等二氧化矽最佳。且二氧化矽較好為球狀二氧化矽。無機填充材可單獨使用1種,亦可組合2種以上。市售之球狀(熔融)二氧化矽列舉為例如ADMATECHS(股)製之「SO-C1」、「SO-C2」、「SO-C4」、「SO-C5」、「SO-C6」。 The inorganic filler is exemplified by, for example, cerium oxide, aluminum oxide, barium sulfate, talc, clay, mica powder, aluminum hydroxide, magnesium hydroxide, carbon. Calcium acid, magnesium carbonate, magnesium oxide, boron nitride, aluminum borate, barium titanate, barium titanate, calcium titanate, magnesium titanate, barium titanate, titanium oxide, barium zirconate, and calcium zirconate. Among these, cerium oxide such as amorphous cerium oxide, molten cerium oxide, crystalline cerium oxide, synthetic cerium oxide, and hollow cerium oxide is preferred. Further, the cerium oxide is preferably spherical cerium oxide. The inorganic filler may be used singly or in combination of two or more. Commercially available spherical (melted) cerium oxide is exemplified by "SO-C1", "SO-C2", "SO-C4", "SO-C5", and "SO-C6" manufactured by ADMATECHS Co., Ltd., for example.

無機填充材之平均粒徑為6μm以上時由於有樹脂組成物之流動性及成形性惡化、作成硬化物時在高頻下之磁導率及磁性損失、以及初期電阻值惡化之虞,故基於提高樹脂組成物之流動性之觀點,較好為0.01μm~5μm之範圍,更好為0.05μm~5μm,又更好為0.05μm~2.5μm之範圍,再更好為0.1μm~1.5μm之範圍,最好為0.3μm~1.0μm之範圍。 When the average particle diameter of the inorganic filler is 6 μm or more, the fluidity and the moldability of the resin composition are deteriorated, the magnetic permeability and the magnetic loss at a high frequency when the cured product is formed, and the initial resistance value are deteriorated. The viewpoint of improving the fluidity of the resin composition is preferably in the range of 0.01 μm to 5 μm, more preferably 0.05 μm to 5 μm, still more preferably in the range of 0.05 μm to 2.5 μm, and even more preferably in the range of 0.1 μm to 1.5 μm. The range is preferably in the range of 0.3 μm to 1.0 μm.

無機填充材之平均粒徑可基於Mie散射理論以雷射繞射‧散射法測定。具體而言可利用雷射繞射散射式粒度分佈測定裝置,以體積基準製作無機填充材之粒度分佈,以其中值徑作為平均粒徑而測定。該情況下較好使用以超音波使無機填充材分散於水中而成之測定樣品。雷射繞射散射式粒度分佈測定裝置可使用堀場製作所(股)製之「LA-500」等。 The average particle size of the inorganic filler can be determined by the laser diffraction ‧ scattering method based on the Mie scattering theory. Specifically, the laser diffraction scattering type particle size distribution measuring apparatus can be used to prepare the particle size distribution of the inorganic filler on a volume basis, and the median diameter is measured as the average particle diameter. In this case, a measurement sample obtained by dispersing an inorganic filler in water by ultrasonic waves is preferably used. For the laser diffraction scattering type particle size distribution measuring apparatus, "LA-500" manufactured by Horiba, Ltd., etc. can be used.

基於提高耐濕性及分散性之觀點,無機填充材較好經胺基矽烷系偶合劑、環氧基矽烷系偶合劑、巰基 矽烷系偶合劑、矽烷系偶合劑、有機矽氮烷化合物、鈦酸酯系偶合劑等之1種以上之表面處理劑處理。該表面處理劑之市售品列舉為例如信越化學工業(股)製之「KBM403」(3-縮水甘油氧基丙基三甲氧基矽烷)、信越化學工業(股)製之「KBM803」(3-巰基丙基三甲氧基矽烷)、信越化學工業(股)製之「KBE903」(3-胺基丙基三乙氧基矽烷)、信越化學工業(股)製之「KBM573」(N-苯基-3-胺基丙基三甲氧基矽烷)、信越化學工業(股)製之「SZ-31」(六甲基二矽氮烷)等。 The inorganic filler is preferably an amine decane coupling agent, an epoxy decane coupling agent, or a sulfhydryl group, from the viewpoint of improving moisture resistance and dispersibility. One or more kinds of surface treatment agents such as a decane coupling agent, a decane coupling agent, an organic decane compound, and a titanate coupling agent are used. The commercially available product of the surface treatment agent is, for example, "KBM403" (3-glycidoxypropyltrimethoxydecane) manufactured by Shin-Etsu Chemical Co., Ltd., and "KBM803" manufactured by Shin-Etsu Chemical Co., Ltd. (3) "Methyl propyl trimethoxy decane", "KBE903" (3-aminopropyltriethoxy decane) manufactured by Shin-Etsu Chemical Co., Ltd., "KBM573" (N-Benzene) manufactured by Shin-Etsu Chemical Co., Ltd. "Zy-3-aminopropyltrimethoxydecane", "SZ-31" (hexamethyldioxane) manufactured by Shin-Etsu Chemical Co., Ltd., etc.

以表面處理劑表面處理之無機填充材可藉由溶劑(例如,甲基乙基酮(MEK))洗淨處理後,測定無機填充材之每單位表面積之碳量。具體而言,於以表面處理劑表面處理之無機填充材中添加作為溶劑之充分量MEK,在25℃進行超音波洗淨5分鐘。接著,去除上澄液,使不揮發成分(固體成分)乾燥後,使用碳分析計測定無機填充材之每單位表面積之碳量。碳分析計可使用堀場製作所(股)製之「EMIA-320V」等。 The inorganic filler surface-treated with the surface treatment agent can be washed by a solvent (for example, methyl ethyl ketone (MEK)), and the amount of carbon per unit surface area of the inorganic filler is measured. Specifically, a sufficient amount of MEK as a solvent was added to the inorganic filler surface-treated with the surface treatment agent, and ultrasonic cleaning was performed at 25 ° C for 5 minutes. Next, the supernatant liquid was removed, and the nonvolatile matter (solid content) was dried, and then the amount of carbon per unit surface area of the inorganic filler was measured using a carbon analyzer. For the carbon analyzer, "EMIA-320V" manufactured by Horiba Ltd. can be used.

基於提高無機填充材之分散性之觀點,無機填充材之每單位表面積之碳量較好為0.02mg/m2以上,更好為0.1mg/m2以上,又更好為0.2mg/m2以上。另一方面,基於抑制熔融黏度上升之觀點,無機填充材之每單位表面積之碳量較好為1mg/m2以下,更好為0.8mg/m2以下,又更好為0.5mg/m2以下。 The amount of carbon per unit surface area of the inorganic filler is preferably 0.02 mg/m 2 or more, more preferably 0.1 mg/m 2 or more, still more preferably 0.2 mg/m 2 , from the viewpoint of improving the dispersibility of the inorganic filler. the above. On the other hand, the amount of carbon per unit surface area of the inorganic filler is preferably 1 mg/m 2 or less, more preferably 0.8 mg/m 2 or less, still more preferably 0.5 mg/m 2 , from the viewpoint of suppressing an increase in melt viscosity. the following.

樹脂組成物中,磁性填料的成分(B)與無機填 充材的成分(C)之含量,以無機填充材含量除以磁性填料含量之值(以下有時記載為「無機填充材(成分(C))/磁性填料(成分(B))」)係設為0.3~3.0之範圍。無機填充材/磁性填料較好為0.4~2.7之範圍,更好為0.5~2.5之範圍。 In the resin composition, the component (B) of the magnetic filler and the inorganic filler The content of the component (C) of the filler is the value of the content of the inorganic filler divided by the content of the magnetic filler (hereinafter referred to as "inorganic filler (component (C)) / magnetic filler (component (B))") Set to a range of 0.3 to 3.0. The inorganic filler/magnetic filler is preferably in the range of 0.4 to 2.7, more preferably in the range of 0.5 to 2.5.

樹脂組成物中,磁性填料的成分(B)與無機填充材的成分(C)之含量合計較好為20體積%~75體積%,更好為20體積%~65體積%,又更好為22體積%~60體積%,再更好為24體積%~57體積%。 In the resin composition, the content of the component (B) of the magnetic filler and the component (C) of the inorganic filler is preferably from 20% by volume to 75% by volume, more preferably from 20% by volume to 65% by volume, more preferably 22% by volume to 60% by volume, more preferably 24% by volume to 57% by volume.

樹脂組成物中,基於使作成硬化物時之磁導率及磁性損失均在良好範圍內之觀點,較好成分(B)之含量為20體積%~25體積%,成分(C)之含量為10體積%~25體積%,且成分(B)與成分(C)之含量合計為30體積%~50體積%。 In the resin composition, the content of the component (B) is preferably from 20% by volume to 25% by volume based on the viewpoint that the magnetic permeability and the magnetic loss when the cured product are formed are in a good range, and the content of the component (C) is 10% by volume to 25% by volume, and the total content of the component (B) and the component (C) is 30% by volume to 50% by volume.

磁性填料之平均粒徑較好大於無機填充材之平均粒徑。 The average particle diameter of the magnetic filler is preferably larger than the average particle diameter of the inorganic filler.

若使磁性填料及無機填充材之含量比例如前述,且使磁性填料之平均粒徑大於無機填充材之平均粒徑,則可以包圍磁性填料粒子周圍之方式有效地配置無機填充材。藉此,可防止磁性填料粒子彼此凝聚而相互接觸,且可使磁性填料粒子彼此分開,故可利用所調配之磁性填料提高磁導率並實現良好的絕緣性。 When the content ratio of the magnetic filler and the inorganic filler is as described above, and the average particle diameter of the magnetic filler is larger than the average particle diameter of the inorganic filler, the inorganic filler can be efficiently disposed so as to surround the periphery of the magnetic filler particles. Thereby, the magnetic filler particles can be prevented from aggregating and contacting each other, and the magnetic filler particles can be separated from each other, so that the magnetic filler can be used to increase the magnetic permeability and achieve good insulation.

結果,將本實施形態之樹脂組成物作成硬化物時,可使在頻率為1GHz至3GHz時之磁導率成為1.1以上,進而可為1.2以上,且可使頻率為1GHz至3GHz 時之磁性損失成為0.5以下,進而可成為0.3以下。 As a result, when the resin composition of the present embodiment is used as a cured product, the magnetic permeability at a frequency of 1 GHz to 3 GHz can be 1.1 or more, further 1.2 or more, and the frequency can be 1 GHz to 3 GHz. The magnetic loss at this time is 0.5 or less, and further 0.3 or less.

(其他成分) (other ingredients)

樹脂組成物含有用於使樹脂組成物硬化之硬化劑作為其他成分,進而亦可視需要含有用以調整樹脂組成物或其硬化物之特性之成分。其他成分列舉為例如熱可塑性樹脂、硬化促進劑、難燃劑、有機填充材,進而列舉為有機銅化合物、有機鋅化合物及有機鈷化合物等有機金屬化合物、以及增黏劑、消泡劑、調平劑、密著性賦予劑、及著色劑等樹脂添加劑等。以下,針對該等中之硬化劑、熱可塑性樹脂、硬化促進劑、難燃劑、有機填充材加以說明。 The resin composition contains a curing agent for curing the resin composition as another component, and may further contain a component for adjusting the properties of the resin composition or the cured product thereof as needed. Other components are, for example, thermoplastic resins, curing accelerators, flame retardants, and organic fillers, and are exemplified by organometallic compounds such as organic copper compounds, organozinc compounds, and organic cobalt compounds, and tackifiers, defoamers, and modulating agents. A resin additive such as a flat agent, a tackifier, or a coloring agent. Hereinafter, the curing agent, the thermoplastic resin, the curing accelerator, the flame retardant, and the organic filler in the above will be described.

-硬化劑- -hardener-

硬化劑只要具有使熱硬化性樹脂的成分(A)硬化之功能即無特別限制。成分(A)為環氧樹脂時,硬化劑為環氧樹脂硬化劑。環氧樹脂硬化劑列舉為例如酚系硬化劑、萘酚系硬化劑、活性酯系硬化劑、苯并噁嗪系硬化劑、及氰酸酯系硬化劑。環氧樹脂硬化劑可單獨使用1種,或亦可併用2種以上。基於絕緣性之信賴性及耐熱性之觀點,硬化劑較好為酚系硬化劑及萘酚系硬化劑,更好為酚系硬化劑。 The curing agent is not particularly limited as long as it has a function of curing the component (A) of the thermosetting resin. When the component (A) is an epoxy resin, the hardener is an epoxy resin hardener. The epoxy resin hardener is exemplified by, for example, a phenol-based curing agent, a naphthol-based curing agent, an active ester-based curing agent, a benzoxazine-based curing agent, and a cyanate-based curing agent. The epoxy resin hardener may be used singly or in combination of two or more. The curing agent is preferably a phenol-based curing agent or a naphthol-based curing agent, and more preferably a phenol-based curing agent, from the viewpoint of reliability of insulation and heat resistance.

酚系硬化劑及萘酚系硬化劑列舉為例如具有酚醛清漆構造之酚系硬化劑、具有酚醛清漆構造之萘酚系硬化劑、含氮酚系硬化劑、含有三嗪骨架之甲酚系硬化 劑、含有三嗪骨架之酚系硬化劑。基於難燃性及反應性之觀點,酚系硬化劑及萘酚系硬化劑較好為含有三嗪骨架之甲酚系硬化劑及含有三嗪骨架之酚系硬化劑,更好為含有三嗪骨架之酚系硬化劑。 The phenolic curing agent and the naphthol-based curing agent are, for example, a phenolic curing agent having a novolak structure, a naphthol-based curing agent having a novolak structure, a nitrogen-containing phenol-based curing agent, and a cresol-based curing containing a triazine skeleton. A phenolic hardener containing a triazine skeleton. The phenolic curing agent and the naphthol-based curing agent are preferably a cresol-based curing agent containing a triazine skeleton and a phenol-based curing agent containing a triazine skeleton, and more preferably contain a triazine, from the viewpoint of flame retardancy and reactivity. A phenolic hardener for the skeleton.

酚系硬化劑及萘酚系硬化劑之具體例列舉為例如明和化成(股)製之「MEH-7700」、「MEH-7810」、「MEH-7851」、日本化藥(股)製之「NHN」、「CBN」、「GPH」、東都化成(股)製之「SN170」、「SN180」、「SN190」、「SN475」、「SN485」、「SN495」、「SN375」、「SN395」、DIC(股)製之「LA7052」、「LA7054」、「LA3018」等。 Specific examples of the phenolic curing agent and the naphthol-based curing agent are, for example, "MEH-7700", "MEH-7810", "MEH-7851", and "Nippon Chemical Co., Ltd." manufactured by Mingwa Kasei Co., Ltd. "SN170", "SN180", "SN190", "SN475", "SN485", "SN495", "SN375", "SN395", "NHN", "CBN", "GPH", and Dongdu Chemicals Co., Ltd. "LA7052", "LA7054", "LA3018", etc. of DIC (share) system.

活性酯系硬化劑並無特別限制,一般較好使用酚酯類、噻吩酯類、N-羥基胺酯類、雜環羥基化合物之酯類等之1分子中具有2個以上之反應活性高之酯基之化合物。該活性酯系硬化劑較好為藉由羧酸化合物及/或硫代羧酸化合物與羥基化合物及/或硫醇化合物之縮合反應而得之硬化劑。尤其基於提高耐熱性之觀點,較好為由羧酸化合物與羥基化合物所得之活性酯系硬化劑,更好為由羧酸化合物與酚化合物及/或萘酚化合物所得之活性酯系硬化劑。羧酸化合物列舉為例如苯甲酸、乙酸、琥珀酸、馬來酸、衣康酸、鄰苯二甲酸、間苯二甲酸、對苯二甲酸、均苯四酸等。酚化合物或萘酚化合物列舉為例如氫醌、間苯二酚、雙酚A、雙酚F、雙酚S、酚酞(phenolphthalin)、甲基化雙酚A、甲基化雙酚F、甲基化 雙酚S、苯酚、鄰-甲酚、間-甲酚、對-甲酚、兒茶酚、α-萘酚、β-萘酚、1,5-二羥基萘、1,6-二羥基萘、2,6-二羥基萘、二羥基二苯甲酮、三羥基二苯甲酮、四羥基二苯甲酮、間苯三酚、苯三酚、二環戊二烯型二酚化合物、酚酚醛清漆等。 The active ester-based curing agent is not particularly limited, and it is generally preferred to use two or more reactive substances such as phenol esters, thiophene esters, N-hydroxylamine esters, and esters of heterocyclic hydroxy compounds. Ester-based compound. The active ester-based curing agent is preferably a curing agent obtained by a condensation reaction of a carboxylic acid compound and/or a thiocarboxylic acid compound with a hydroxy compound and/or a thiol compound. In particular, from the viewpoint of improving heat resistance, the active ester-based curing agent obtained from the carboxylic acid compound and the hydroxy compound is more preferably an active ester-based curing agent obtained from a carboxylic acid compound and a phenol compound and/or a naphthol compound. The carboxylic acid compound is exemplified by, for example, benzoic acid, acetic acid, succinic acid, maleic acid, itaconic acid, phthalic acid, isophthalic acid, terephthalic acid, pyromellitic acid or the like. Phenolic compounds or naphthol compounds are exemplified by, for example, hydroquinone, resorcinol, bisphenol A, bisphenol F, bisphenol S, phenolphthalin, methylated bisphenol A, methylated bisphenol F, methyl Chemical Bisphenol S, phenol, o-cresol, m-cresol, p-cresol, catechol, α-naphthol, β-naphthol, 1,5-dihydroxynaphthalene, 1,6-dihydroxynaphthalene , 2,6-dihydroxynaphthalene, dihydroxybenzophenone, trihydroxybenzophenone, tetrahydroxybenzophenone, phloroglucinol, benzenetriol, dicyclopentadiene diphenol compound, phenol Novolac and the like.

活性酯系硬化劑具體列舉為含二環戊二烯型二酚縮合構造之活性酯化合物、含萘構造之活性酯化合物、含酚酚醛清漆之乙醯化物之活性酯化合物、含酚酚醛清漆之苯甲醯化物之活性酯化合物。 The active ester-based hardener is specifically exemplified by an active ester compound containing a dicyclopentadiene-type diphenol condensation structure, an active ester compound containing a naphthalene structure, an active ester compound of a phenolic novolac-containing acetal, and a phenol-containing phenol varnish. An active ester compound of benzamidine.

活性酯系硬化劑之市售品,作為例如含二環戊二烯型二酚縮合構造之活性酯化合物列舉為DIC(股)製之「EXB9451」、「EXB9460」、「EXB9460S」、「HPC-8000-65T」,含萘構造之活性酯化合物列舉為DIC(股)製之「EXB9416-70BK」,含酚酚醛清漆之乙醯化物之活性酯化合物列舉為三菱化學(股)製之「DC808」,含酚酚醛清漆之苯甲醯化物之活性酯化合物列舉為三菱化學(股)製之「YLH1026」等。 A commercially available product of an active ester-based curing agent is, for example, "EXB9451", "EXB9460", "EXB9460S", "HPC-" manufactured by DIC Co., Ltd. as an active ester compound containing a dicyclopentadiene-type diphenol condensation structure. 8000-65T", the active ester compound containing a naphthalene structure is exemplified by "EXB9416-70BK" manufactured by DIC Co., Ltd., and the active ester compound of acetal containing phenol novolac is exemplified by "DC808" manufactured by Mitsubishi Chemical Corporation. The active ester compound of the phenformin containing phenol novolac is exemplified by "YLH1026" manufactured by Mitsubishi Chemical Corporation.

苯并噁嗪系硬化劑之具體例列舉為例如昭和高分子(股)製之「HFB2006M」、四國化成工業(股)製之「P-d」、「F-a」。 Specific examples of the benzoxazine-based curing agent are, for example, "HFB2006M" manufactured by Showa Polymer Co., Ltd., and "P-d" and "F-a" manufactured by Shikoku Chemical Industries Co., Ltd.

氰酸酯系硬化劑列舉為例如雙酚A二異氰酸酯、多酚氰酸酯(寡聚(3-亞甲基-1,5-伸苯基氰酸酯)、4,4’-亞甲基雙(2,6-二甲基苯基氰酸酯)、4,4’-亞乙基二苯基二氰酸酯、六氟雙酚A二氰酸酯、2,2-雙(4-氰酸酯)苯基丙 烷、1,1-雙(4-氰酸酯苯基甲烷)、雙(4-氰酸酯-3,5-二甲基苯基)甲烷、1,3-雙(4-氰酸酯苯基-1-(甲基亞乙基))苯、雙(4-氰酸酯苯基)硫醚、及雙(4-氰酸酯苯基)醚等之2官能氰酸酯樹脂,由酚酚醛清漆及甲酚酚醛清漆等衍生之多官能氰酸酯樹脂,使該等氰酸酯樹脂一部分三嗪化之預聚物等。氰酸酯系硬化劑之具體例列舉為日本LONZA(股)製之「PT30」及「PT60」(均為酚酚醛清漆型多官能氰酸酯樹脂)、「BA230」(雙酚A二異氰酸酯之一部分或全部經三嗪化之3聚物之預聚物)等。 Cyanate-based hardeners are exemplified by, for example, bisphenol A diisocyanate, polyphenol cyanate (oligo(3-methylene-1,5-phenylene), 4,4'-methylene Bis(2,6-dimethylphenyl cyanate), 4,4'-ethylene diphenyl dicyanate, hexafluorobisphenol A dicyanate, 2,2-bis (4- Cyanate ester Alkane, 1,1-bis(4-cyanate phenylmethane), bis(4-cyanate-3,5-dimethylphenyl)methane, 1,3-bis(4-cyanate benzene) 2-functional cyanate resin such as keto-1-(methylethylidene) benzene, bis(4-cyanate phenyl) sulfide, and bis(4-cyanate phenyl) ether, from phenol A polyfunctional cyanate resin derived from a novolac and a cresol novolak, or a prepolymer which is a triazine-formed part of the cyanate resin. Specific examples of the cyanate-based curing agent are "PT30" and "PT60" (all phenol novolac type polyfunctional cyanate resins) manufactured by LONZA Co., Ltd., and "BA230" (bisphenol A diisocyanate). Part or all of the prepolymer of the triazineated terpolymer) and the like.

環氧樹脂與環氧樹脂硬化劑之量比以[環氧樹脂之環氧基之合計數]:[環氧樹脂硬化劑之反應基之合計數]之比率計,較好為1:0.2~1:2之範圍,更好為1:0.3~1:1.5之範圍,又更好為1:0.4~1:1之範圍。此處,所謂環氧樹脂硬化劑之反應基為活性羥基、活性酯基等,根據硬化劑種類而異。且,所謂環氧樹脂之環氧基之合計數係針對所有環氧樹脂,將各環氧樹脂之不揮發成分之質量除以環氧當量獲得之值予以合計之值,所謂環氧樹脂硬化劑之反應基之合計數係針對所有環氧樹脂硬化劑,將各環氧樹脂硬化劑之不揮發成分之質量除以反應基當量獲得之值予以合計之值。藉由使環氧樹脂與環氧樹脂硬化劑之量比成為該範圍內,能進一步提高成為硬化物時之耐熱性。 The ratio of the epoxy resin to the epoxy resin hardener is preferably 1:0.2 as the ratio of [the total number of epoxy groups of the epoxy resin]: [the total number of reactive groups of the epoxy resin hardener]. The range of 1:2 is preferably in the range of 1:0.3 to 1:1.5, and more preferably in the range of 1:0.4 to 1:1. Here, the reactive group of the epoxy resin curing agent is an active hydroxyl group, an active ester group, or the like, and varies depending on the type of the curing agent. Further, the total number of epoxy groups of the epoxy resin is a total of values obtained by dividing the mass of the nonvolatile component of each epoxy resin by the equivalent of the epoxy equivalent for all the epoxy resins, and the so-called epoxy resin hardener The total number of reactive groups is a total value obtained by dividing the mass of the nonvolatile component of each epoxy resin hardener by the equivalent of the reactive base for all the epoxy resin hardeners. When the ratio of the epoxy resin to the epoxy resin hardener is within this range, the heat resistance at the time of becoming a cured product can be further improved.

關於環氧樹脂硬化劑之含量,環氧樹脂之環氧基之合計數與環氧樹脂硬化劑之反應基之合計數之比, 較好為1:0.2~1:2之範圍,更好為1:0.3~1:1.5之範圍,又更好為1:0.4~1:1之範圍。 Regarding the content of the epoxy resin hardener, the ratio of the total number of epoxy groups of the epoxy resin to the total number of reactive groups of the epoxy resin hardener, It is preferably in the range of 1:0.2 to 1:2, more preferably in the range of 1:0.3 to 1:1.5, and more preferably in the range of 1:0.4 to 1:1.

樹脂組成物較好分別含有作為環氧樹脂之液狀環氧樹脂與固體狀環氧樹脂之混合物(液狀環氧樹脂:固體狀環氧樹脂之質量比,較好為1:0.1~1:4之範圍,更好為1:0.3~1:3.5之範圍,又更好為1:0.6~1:3之範圍,最好為1:0.8~1:2.5之範圍),作為環氧樹脂硬化劑之自酚系硬化劑、萘酚系硬化劑、活性酯系硬化劑及二氰酸酯系硬化劑所組成之群選出之1種以上(較好為由酚系硬化劑、萘酚系硬化劑所組成之群選出之1種以上,更好為由含有三嗪骨架之酚酚醛清漆樹脂、萘酚系硬化劑所組成之群選出之1種以上,又更好為包含含有三嗪骨架之酚酚醛清漆樹脂之環氧樹脂硬化劑)。 The resin composition preferably contains a mixture of a liquid epoxy resin as an epoxy resin and a solid epoxy resin (liquid epoxy resin: solid epoxy resin mass ratio, preferably 1:0.1 to 1: The range of 4 is preferably in the range of 1:0.3 to 1:3.5, and more preferably in the range of 1:0.6 to 1:3, preferably in the range of 1:0.8 to 1:2.5), which is hardened as an epoxy resin. One or more selected from the group consisting of a phenolic curing agent, a naphthol-based curing agent, an active ester-based curing agent, and a dicyanate-based curing agent (preferably, a phenolic curing agent or a naphthol-based curing agent) One or more selected from the group consisting of a phenol novolac resin containing a triazine skeleton and a naphthol-based curing agent, and more preferably one or more containing a triazine skeleton. Epoxy resin hardener for phenol novolac resin).

-熱可塑性樹脂- - Thermoplastic Resin -

熱可塑性樹脂列舉為例如苯氧樹脂、丙烯酸樹脂、聚乙烯乙縮醛樹脂、聚醯亞胺樹脂、聚醯胺醯亞胺樹脂、聚醚碸樹脂及聚碸樹脂等。熱可塑性樹脂可單獨使用1種,或亦可併用2種以上。 The thermoplastic resin is exemplified by, for example, a phenoxy resin, an acrylic resin, a polyvinyl acetal resin, a polyimide resin, a polyamidoximine resin, a polyether oxime resin, and a polyfluorene resin. The thermoplastic resin may be used singly or in combination of two or more.

熱可塑性樹脂之聚苯乙烯換算之重量平均分子量較好為8000~70000之範圍,更好為10000~60000之範圍,又更好為20000~60000之範圍。熱可塑性樹脂之聚苯乙烯換算之重量平均分子量係以凝膠滲透層析(GPC)法測定。具體而言,熱可塑性樹脂之聚苯乙烯換算之重量平 均分子量係使用島津製作所(股)製之「LC-9A/RID-6A」作為測定裝置,使用昭和電工(股)製之「Shodex K-800P/K-804L/K-804L」作為管柱,使用氯仿等作為移動相,將管柱溫度設為40℃進行測定,且使用標準聚苯乙烯之校正線算出。 The weight average molecular weight of the thermoplastic resin in terms of polystyrene is preferably in the range of 8,000 to 70,000, more preferably in the range of 10,000 to 60,000, and more preferably in the range of 20,000 to 60,000. The polystyrene-equivalent weight average molecular weight of the thermoplastic resin is measured by a gel permeation chromatography (GPC) method. Specifically, the polystyrene-converted weight of the thermoplastic resin is flat. "Shodex K-800P/K-804L/K-804L" manufactured by Showa Denko Co., Ltd. is used as a pipe column, and "LC-9A/RID-6A" manufactured by Shimadzu Corporation is used as a measuring device. Using chloroform or the like as a mobile phase, the column temperature was measured at 40 ° C, and it was calculated using a calibration line of standard polystyrene.

苯氧樹脂列舉為例如具有由雙酚A骨架、雙酚F骨架、雙酚S骨架、雙酚苯乙酮骨架、酚醛清漆骨架、聯苯骨架、茀骨架、二環戊二烯骨架、降冰片烯骨架、萘骨架、蒽骨架、金剛烷骨架、萜烯骨架、及三甲基環己烷骨架所組成之群選出之1種以上骨架之苯氧樹脂。苯氧樹脂之末端可為酚性羥基、環氧基等任一官能基。苯氧樹脂可單獨使用1種,或亦可併用2種以上。苯氧樹脂之具體例列舉為三菱化學(股)製之「1256」及「4250」(均為含有雙酚A骨架之苯氧樹脂)、「YX8100」(含有雙酚S骨架之苯氧樹脂)、及「YX6954」(含有雙酚苯乙酮骨架之苯氧樹脂),此外,列舉為東都化成(股)製之「FX280」及「FX293」、三菱化學(股)製之「YL7553」、「YL6794」、「YL7213」、「YL7290」及「YL7482」等。 The phenoxy resin is exemplified by, for example, having a bisphenol A skeleton, a bisphenol F skeleton, a bisphenol S skeleton, a bisphenol acetophenone skeleton, a novolac skeleton, a biphenyl skeleton, an anthracene skeleton, a dicyclopentadiene skeleton, and a norbornene. A phenoxy resin having one or more kinds of skeletons selected from the group consisting of an olefin skeleton, a naphthalene skeleton, an anthracene skeleton, an adamantane skeleton, a terpene skeleton, and a trimethylcyclohexane skeleton. The terminal of the phenoxy resin may be any functional group such as a phenolic hydroxyl group or an epoxy group. The phenoxy resin may be used singly or in combination of two or more. Specific examples of the phenoxy resin are "1256" and "4250" (all are phenoxy resins containing a bisphenol A skeleton) and "YX8100" (a phenoxy resin containing a bisphenol S skeleton) manufactured by Mitsubishi Chemical Corporation. And "YX6954" (phenoxy resin containing bisphenol acetophenone skeleton), and "FX280" and "FX293" manufactured by Dongdu Chemical Co., Ltd., and "YL7553" manufactured by Mitsubishi Chemical Corporation. YL6794", "YL7213", "YL7290" and "YL7482".

基於使熱膨脹率及彈性率更降低之觀點,丙烯酸樹脂較好為含有官能基之丙烯酸樹脂,更好為玻璃轉移溫度為25℃以下之含有環氧基之丙烯酸樹脂。 The acrylic resin is preferably an acrylic resin containing a functional group, and more preferably an epoxy group-containing acrylic resin having a glass transition temperature of 25 ° C or less, from the viewpoint of further lowering the coefficient of thermal expansion and the modulus of elasticity.

含有官能基之丙烯酸樹脂之數平均分子量(Mn)較好為10000~1000000,更好為30000~900000。 The number average molecular weight (Mn) of the functional group-containing acrylic resin is preferably from 10,000 to 1,000,000, more preferably from 30,000 to 900,000.

含有官能基之丙烯酸樹脂之官能基當量較好為1000~50000,更好為2500~30000。 The functional group equivalent of the functional group-containing acrylic resin is preferably from 1,000 to 50,000, more preferably from 2,500 to 30,000.

玻璃轉移溫度為25℃以下之含有環氧基之丙烯酸樹脂較好為玻璃轉移溫度為25℃以下之含有環氧基之丙烯酸酯共聚物樹脂,其具體例列舉為NagaseChemtex(股)製之「SG-80H」(含有環氧基之丙烯酸酯共聚物樹脂(數平均分子量Mn:350000g/mol,環氧價0.07eq/kg,玻璃轉移溫度11℃)、NagaseChemtex(股)製之「SG-P3」(含有環氧基之丙烯酸酯共聚物樹脂(數平均分子量Mn:850000g/mol,環氧價0.21eq/kg,玻璃轉移溫度12℃))。 The epoxy group-containing acrylic resin having a glass transition temperature of 25 ° C or less is preferably an epoxy group-containing acrylate copolymer resin having a glass transition temperature of 25 ° C or less, and specific examples thereof are "SG" manufactured by Nagase Chemtex Co., Ltd. -80H" (epoxy group-containing acrylate copolymer resin (number average molecular weight Mn: 350,000 g/mol, epoxy price: 0.07 eq/kg, glass transition temperature: 11 ° C), and "SG-P3" manufactured by Nagase Chemtex Co., Ltd. (Epoxy group-containing acrylate copolymer resin (number average molecular weight Mn: 850,000 g/mol, epoxy price 0.21 eq/kg, glass transition temperature: 12 ° C)).

聚乙烯乙縮醛樹脂之具體例列舉為電化學工業(股)製之電化丁醛「4000-2」、「5000-A」、「6000-C」、「6000-EP」、積水化學工業(股)製之S-LEC BH系列、BX系列、「KS-1」等KS系列、BL系列、BM系列等。 Specific examples of the polyethylene acetal resin are electrochemical butadiene "4000-2", "5000-A", "6000-C", "6000-EP", and Sekisui Chemical Industry Co., Ltd. S-LEC BH series, BX series, "KS-1" and other KS series, BL series, BM series, etc.

聚醯亞胺樹脂之具體例列舉為新日本理化(股)製之「RIKACOAT SN20」及「RIKACOAT PN20」。聚醯亞胺樹脂之具體例又列舉為使2官能性羥基末端聚丁二烯、二異氰酸酯化合物及四元酸酐反應獲得之線狀聚醯亞胺(日本特開2006-37083號公報所記載之聚醯亞胺樹脂)、含有聚矽氧烷骨架之聚醯亞胺(日本特開2002-12667號公報及日本特開2000-319386號公報等所記載之聚醯亞胺樹脂)等改質聚醯亞胺。 Specific examples of the polyimine resin are "RIKACOAT SN20" and "RIKACOAT PN20" manufactured by Nippon Chemical and Chemical Co., Ltd. Specific examples of the polyimine resin include a linear polyimine obtained by reacting a bifunctional hydroxyl-terminated polybutadiene, a diisocyanate compound, and a tetrabasic acid anhydride (Japanese Patent Laid-Open Publication No. Hei. No. 2006-37083). Poly-imine resin), a polyfluorene-containing polyamine (polyimide resin described in JP-A-2002-210667, JP-A-2000-319386, etc.) Yttrium.

聚醯胺醯亞胺樹脂之具體例列舉為東陽紡績 (股)製之「VYLOMAX HR11NN」及「VYLOMAX HR16NN」。聚醯胺醯亞胺樹脂之具體例列舉為含有聚矽氧烷骨架之聚醯胺醯亞胺之日立化成工業(股)製之「KS9100」、「KS9300」等改質聚醯胺醯亞胺。 Specific examples of polyamidoximine resins are listed as Dongyang Textile "VYLOMAX HR11NN" and "VYLOMAX HR16NN". Specific examples of the polyamidoximine resin include modified polyamidoquinone imines such as "KS9100" and "KS9300" manufactured by Hitachi Chemical Co., Ltd., which is a polyamine oxide skeleton containing a polyoxyalkylene skeleton. .

聚醚碸樹脂之具體例列舉為住友化學(股)製之「PES5003P」等。 Specific examples of the polyether oxime resin are "PES5003P" manufactured by Sumitomo Chemical Co., Ltd., and the like.

聚碸樹脂之具體例列舉為SOLVAY ADVANCE POLYMERS(股)製之「P1700」、「P3500」等。 Specific examples of the polybenzazole resin are "P1700" and "P3500" manufactured by SOLVAY ADVANCE POLYMERS Co., Ltd.

樹脂組成物中之熱可塑性樹脂之含量較好為0.1質量%~20質量%。藉由使熱可塑性樹脂之含量成為該範圍內,可使樹脂組成物之黏度適度,形成厚度或整體性狀均一之樹脂組成物層。 The content of the thermoplastic resin in the resin composition is preferably from 0.1% by mass to 20% by mass. When the content of the thermoplastic resin is within this range, the viscosity of the resin composition can be made moderate, and a resin composition layer having a uniform thickness or overall properties can be formed.

-硬化促進劑- - hardening accelerator -

硬化促進劑列舉為例如磷系硬化促進劑、胺系硬化促進劑、咪唑系硬化促進劑、胍系硬化促進劑等。 The hardening accelerator is exemplified by, for example, a phosphorus-based curing accelerator, an amine-based curing accelerator, an imidazole-based curing accelerator, and an oxime-based curing accelerator.

磷系硬化促進劑列舉為例如三苯膦、鏻硼酸鹽化合物、四苯基鏻四苯基硼酸鹽、正丁基鏻四苯基硼酸鹽、四丁基鏻癸酸鹽、(4-甲基苯基)三苯基鏻硫代氰酸鹽、四苯基鏻硫代氰酸鹽、丁基三苯基鏻硫代氰酸鹽等。 Phosphorus-based hardening accelerators are exemplified by, for example, triphenylphosphine, strontium borate compound, tetraphenylphosphonium tetraphenylborate, n-butylphosphonium tetraphenylborate, tetrabutylphosphonate, (4-methyl Phenyl)triphenylphosphonium thiocyanate, tetraphenylphosphonium thiocyanate, butyltriphenylphosphonium thiocyanate, and the like.

胺系硬化促進劑列舉為例如三乙胺、三丁胺等三烷基胺、4-二甲胺基吡啶(DMAP)、苄基二甲基胺、2,4,6-參(二甲胺基甲基)酚、1,8-二氮雜雙環(5,4,0)-十一碳 烯等。 The amine-based hardening accelerator is exemplified by a trialkylamine such as triethylamine or tributylamine, 4-dimethylaminopyridine (DMAP), benzyldimethylamine, 2,4,6-gin (dimethylamine). Methyl)phenol, 1,8-diazabicyclo(5,4,0)-edecyl Alkene and the like.

咪唑系硬化促進劑列舉為例如2-甲基咪唑、2-十一烷基咪唑、2-十七烷基咪唑、1,2-二甲基咪唑、2-乙基-4-甲基咪唑(2E4MZ)、2-苯基咪唑、2-苯基-4-甲基咪唑、1-苄基-2-甲基咪唑、1-苄基-1-苯基咪唑、1-氰基乙基-2-甲基咪唑、1-氰基乙基-2-十一烷基咪唑、1-氰基乙基-2-甲基-4-甲基咪唑、1-氰基乙基-2-苯基咪唑、1-氰基乙基-2-十一烷基咪唑鎓偏苯三酸鹽、1-氰基乙基-2-苯基咪唑鎓偏苯三酸鹽、2,4-二氰基-6-[2’-甲基咪唑基-(1’)]-乙基-s-三嗪、2,4-二胺基-6-[2’-十一烷基咪唑基-(1’)]-乙基-s-三嗪、2,4-二胺基-6-[2’-乙基-4’-甲基咪唑基-(1’)]-乙基-s-三嗪、2,4-二胺基-6-[2’-甲基咪唑基-(1’)]-乙基-s-三嗪異氰尿酸加成物、2-苯基咪唑異氰尿酸加成物、2-苯基-4,5-二羥基甲基咪唑、2-苯基-4-甲基-5-羥基甲基咪唑、2,3-二氫-1H-吡咯并[1,2-a]苯并咪唑、1-十二烷基-2-甲基-3-苄基咪唑鎓氯化物、2-甲基咪唑啉、2-苯基咪唑啉等咪唑化合物及咪唑化合物與環氧樹脂之加成物。 The imidazole-based hardening accelerator is exemplified by, for example, 2-methylimidazole, 2-undecylimidazole, 2-heptadecylimidazole, 1,2-dimethylimidazole, 2-ethyl-4-methylimidazole ( 2E4MZ), 2-phenylimidazole, 2-phenyl-4-methylimidazole, 1-benzyl-2-methylimidazole, 1-benzyl-1-phenylimidazole, 1-cyanoethyl-2 -methylimidazole, 1-cyanoethyl-2-undecylimidazole, 1-cyanoethyl-2-methyl-4-methylimidazole, 1-cyanoethyl-2-phenylimidazole , 1-cyanoethyl-2-undecylimidazolium trimellitate, 1-cyanoethyl-2-phenylimidazolium trimellitate, 2,4-dicyano-6 -[2'-methylimidazolyl-(1')]-ethyl-s-triazine, 2,4-diamino-6-[2'-undecylimidazolyl-(1')] -ethyl-s-triazine, 2,4-diamino-6-[2'-ethyl-4'-methylimidazolyl-(1')]-ethyl-s-triazine, 2, 4-Diamino-6-[2'-methylimidazolyl-(1')]-ethyl-s-triazine isocyanuric acid adduct, 2-phenylimidazolium isocyanuric acid adduct, 2 -phenyl-4,5-dihydroxymethylimidazole, 2-phenyl-4-methyl-5-hydroxymethylimidazole, 2,3-dihydro-1H-pyrrolo[1,2-a]benzene Imidazole, 1-dodecyl-2-methyl-3-benzylimidazolium Compound, 2-imidazoline, 2-phenyl imidazole compounds, and imidazoline adducts of an imidazole compound with an epoxy resin composition.

胍系硬化促進劑列舉為例如二氰二醯胺、1-甲基胍、1-乙基胍、1-環己基胍、1-苯基胍、1-(鄰-甲苯基)胍、二甲基胍、二苯基胍、三甲基胍、四甲基胍、五甲基胍、1,5,7-三氮雜雙環[4.4.0]癸-5-烯、7-甲基-1,5,7-三氮雜雙環[4.4.0]癸-5-烯、1-甲基雙胍、1-乙基雙胍、1-正丁基雙胍、1-正十八烷基雙胍、1,1-二甲基雙胍、1,1-二乙基雙胍、1-環己基雙胍、1-烯丙基雙胍、1-苯基雙 胍、1-(鄰-甲苯基)雙胍等。 The lanthanide hardening accelerator is exemplified by, for example, dicyandiamide, 1-methyl hydrazine, 1-ethyl hydrazine, 1-cyclohexyl hydrazine, 1-phenyl fluorene, 1-(o-tolyl) fluorene, and dimethyl Base, diphenyl hydrazine, trimethyl hydrazine, tetramethyl hydrazine, pentamethyl hydrazine, 1,5,7-triazabicyclo[4.4.0]non-5-ene, 7-methyl-1 ,5,7-triazabicyclo[4.4.0]non-5-ene, 1-methylbiguanide, 1-ethylbiguanide, 1-n-butylbiguanide, 1-n-octadecylbiguanide, 1, 1-Dimethyl biguanide, 1,1-diethyl biguanide, 1-cyclohexyl biguanide, 1-allyl biguanide, 1-phenyl double 胍, 1-(o-tolyl)biguanide, and the like.

硬化促進劑可單獨使用1種,或亦可組合2種以上使用。將環氧樹脂與環氧樹脂硬化劑之不揮發成分之合計量設為100質量%時,樹脂組成物中之硬化促進劑含量較好在0.05質量%~3質量%之範圍內使用。 The curing accelerator may be used singly or in combination of two or more. When the total amount of the non-volatile components of the epoxy resin and the epoxy resin curing agent is 100% by mass, the content of the curing accelerator in the resin composition is preferably from 0.05% by mass to 3% by mass.

-難燃劑- - Flame retardant -

難燃劑列舉為例如有機磷系難燃劑、有機含氮磷化合物、氮化合物、聚矽氧系難燃劑、金屬氫氧化物等。可使用之難燃劑之例列舉為三光(股)製之「HCA-HQ-HST」。難燃劑可單獨使用1種,或亦可併用2種以上。樹脂組成物層中之難燃劑之含量並無特別限制,但較好為0.5質量%~10質量%之範圍,更好為1質量%~9質量%之範圍,又更好為1.5質量%~8質量%之範圍。 The flame retardant is exemplified by, for example, an organic phosphorus-based flame retardant, an organic nitrogen-containing phosphorus compound, a nitrogen compound, a polyoxygenated flame retardant, a metal hydroxide, or the like. An example of a flame retardant that can be used is "HCA-HQ-HST" manufactured by Sanko Co., Ltd. The flame retardant may be used singly or in combination of two or more. The content of the flame retardant in the resin composition layer is not particularly limited, but is preferably in the range of 0.5% by mass to 10% by mass, more preferably in the range of 1% by mass to 9% by mass, and still more preferably 1.5% by mass. ~8 mass% range.

-有機填充材- -Organic filler -

樹脂組成物基於提高與利用鍍敷步驟形成之層之密著性之觀點,較好含有有機填充材。有機填充材之例列舉為橡膠粒子。有機填充材的橡膠粒子係使用例如不溶解於後述有機溶劑中,且與後述之環氧樹脂、硬化劑及熱可塑性樹脂等亦不相溶之橡膠粒子。該橡膠粒子一般係使橡膠粒子成分之分子量大到不溶解於有機溶劑、樹脂中之程度調製成粒子狀。 The resin composition preferably contains an organic filler based on the viewpoint of improving the adhesion to the layer formed by the plating step. Examples of organic fillers are exemplified by rubber particles. The rubber particles of the organic filler are, for example, rubber particles which are not dissolved in an organic solvent to be described later and which are incompatible with an epoxy resin, a curing agent, a thermoplastic resin or the like which will be described later. The rubber particles are generally prepared in a particulate form such that the molecular weight of the rubber particle component is so large that it is not dissolved in the organic solvent or the resin.

有機填充材的橡膠粒子列舉為例如芯殼型橡 膠粒子、交聯丙烯腈丁二烯橡膠粒子、交聯苯乙烯丁二烯橡膠粒子、丙烯酸橡膠粒子等。芯殼型橡膠粒子為具有芯層與殼層之橡膠粒子,列舉為例如外層之殼層以玻璃狀聚合物構成,內層之芯層以橡膠狀聚合物構成之2層構造,或外層之殼層以玻璃狀聚合物構成,中間層以橡膠狀聚合物構成,內層之芯層以玻璃狀聚合物構成之3層構造之橡膠粒子等。玻璃狀聚合物層為例如以甲基丙烯酸甲酯聚合物等構成,橡膠狀聚合物層以例如丙烯酸丁酯聚合物(丁基橡膠)等構成。可使用之橡膠粒子之例列舉為GANTZ(股)製之「STAFYROID AC3816N」。橡膠粒子可單獨使用1種,或亦可併用2種以上。 Rubber particles of organic fillers are listed, for example, as core-shell rubber Glue particles, crosslinked acrylonitrile butadiene rubber particles, crosslinked styrene butadiene rubber particles, acrylic rubber particles, and the like. The core-shell type rubber particles are rubber particles having a core layer and a shell layer, and are exemplified by a two-layer structure in which a shell layer of an outer layer is a glassy polymer, a core layer of an inner layer is a rubbery polymer, or a shell of an outer layer. The layer is composed of a glassy polymer, the intermediate layer is composed of a rubbery polymer, and the core layer of the inner layer is a rubber particle having a three-layer structure composed of a glassy polymer. The glassy polymer layer is composed of, for example, a methyl methacrylate polymer or the like, and the rubbery polymer layer is composed of, for example, a butyl acrylate polymer (butyl rubber) or the like. An example of the rubber particles that can be used is "STAFYROID AC3816N" manufactured by GANTZ Co., Ltd. The rubber particles may be used singly or in combination of two or more.

有機填充材的橡膠粒子之平均粒徑較好為0.005μm~1μm之範圍,更好為0.2μm~0.6μm之範圍。橡膠粒子之平均粒徑可使用動態光散射法測定。例如,可藉超音波等使橡膠粒子均勻分散於適當有機溶劑中,使用濃厚系粒徑分析儀(大塚電子(股)製「FPAR-1000」),以質量基準作成橡膠粒子之粒度分佈,以其中值徑作為平均粒徑而測定。 The average particle diameter of the rubber particles of the organic filler is preferably in the range of 0.005 μm to 1 μm, more preferably in the range of 0.2 μm to 0.6 μm. The average particle diameter of the rubber particles can be measured by dynamic light scattering. For example, the rubber particles can be uniformly dispersed in a suitable organic solvent by ultrasonic waves or the like, and a particle size distribution of rubber particles can be prepared on a mass basis using a thick particle size analyzer ("FPAR-1000" manufactured by Otsuka Electronics Co., Ltd.). The value diameter is measured as the average particle diameter.

本實施形態之樹脂組成物形成絕緣層時之流動性優異,作成絕緣層(硬化物)時之配線層之密封性優異。且若使用本發明之樹脂組成物形成絕緣層,則可提高在頻率為1GHz以上之高頻帶(千兆赫頻帶),尤其是1GHz至3GHz之範圍內之磁導率,且可抑制磁性損失。 The resin composition of the present embodiment is excellent in fluidity when the insulating layer is formed, and is excellent in the sealing property of the wiring layer when the insulating layer (cured material) is formed. Further, when the insulating layer is formed using the resin composition of the present invention, the magnetic permeability in the high frequency band (gigahertz band) having a frequency of 1 GHz or more, particularly in the range of 1 GHz to 3 GHz, can be improved, and the magnetic loss can be suppressed.

使用本實施形態之樹脂組成物形成之絕緣層 具有優異之絕緣性之信賴性。絕緣性之信賴性可藉例如在130℃、相對濕度85%之條件的環境中放置100小時後(HAST100小時後)之絕緣電阻值降低作為指標進行評價。具體為HAST100小時後之絕緣層之絕緣電阻值超過1.0×106Ω之值時可評價為絕緣性之信賴性優異。 The insulating layer formed using the resin composition of the present embodiment has excellent reliability of insulation. The reliability of the insulating property can be evaluated by, for example, lowering the insulation resistance value after being left in an environment of 130 ° C and a relative humidity of 85% for 100 hours (after HAST 100 hours). Specifically, when the insulation resistance value of the insulating layer after 100 hours of HAST exceeded a value of 1.0 × 10 6 Ω, it was evaluated that the reliability of insulation was excellent.

因此,本實施形態之樹脂組成物可使用作為具備有線圈擠入於絕緣層(積層複數層絕緣層之絕緣部)之厚度內之所謂薄膜構造之電感器元件之配線板之絕緣層的材料。 Therefore, the resin composition of the present embodiment can be used as a material for providing an insulating layer of a wiring board of an inductor element of a so-called thin film structure in which a coil is extruded in a thickness of an insulating layer (an insulating portion in which a plurality of insulating layers are laminated).

接著針對使用本實施形態之樹脂組成物之接著薄膜及其製造步驟加以說明。 Next, a film for using the resin composition of the present embodiment and a manufacturing step thereof will be described.

(接著薄膜) (following the film)

接著薄膜含有有機支撐體、設置於該有機支撐體之一主面上之樹脂組成物層。 Next, the film contains an organic support and a resin composition layer provided on one main surface of the organic support.

(有機支撐體) (organic support)

有機支撐體之材料列舉為例如聚對苯二甲酸乙二酯(PET)、聚萘二甲酸乙二酯(PEN)等聚酯、聚碳酸酯(PC)、聚甲基丙烯酸甲酯(PMMA)等丙烯酸、環狀聚烯烴、三乙醯基纖維素(TAC)、聚醚硫醚(PES)、聚醚酮、聚醯亞胺等。 The material of the organic support is exemplified by polyester such as polyethylene terephthalate (PET), polyethylene naphthalate (PEN), polycarbonate (PC), and polymethyl methacrylate (PMMA). Such as acrylic acid, cyclic polyolefin, triethyl fluorenyl cellulose (TAC), polyether thioether (PES), polyether ketone, polyimine, and the like.

有機支撐體較好使用玻璃轉移溫度(Tg)高的有機支撐體。有機支撐體之玻璃轉移溫度較好為100℃以 上。 The organic support preferably uses an organic support having a high glass transition temperature (Tg). The glass transition temperature of the organic support is preferably 100 ° C. on.

玻璃轉移溫度為100℃以上之有機支撐體之材料列舉為例如聚萘二甲酸乙二酯(PEN)等聚酯、聚碳酸酯(PC)、聚甲基丙烯酸甲酯(PMMA)等丙烯酸、環狀聚烯烴、三乙醯基纖維素(TAC)、聚醚硫醚(PES)、聚醚酮、聚醚醚酮、聚醯亞胺等。其中,基於耐熱性之觀點,以聚萘二甲酸乙二酯、聚醯亞胺較佳。 The material of the organic support having a glass transition temperature of 100 ° C or higher is exemplified by a polyester such as polyethylene naphthalate (PEN), a polycarbonate (PC), or a polymethyl methacrylate (PMMA). Polyolefin, triethyl fluorenyl cellulose (TAC), polyether thioether (PES), polyether ketone, polyether ether ketone, polyimine, and the like. Among them, polyethylene naphthalate and polyimide are preferred from the viewpoint of heat resistance.

含有前述材料之有機支撐體中,亦可對與後述之樹脂組成物層接合之面施以消光處理、電暈處理。 In the organic support containing the above-mentioned material, the surface to be bonded to the resin composition layer described later may be subjected to matting treatment or corona treatment.

此外,有機支撐體亦可於樹脂組成物層所接合之側,亦即塗佈樹脂組成物之側上具有脫模層之「附脫模層之有機支撐體」(以下有時將附脫模層之有機支撐體簡稱為有機支撐體)。附脫模層之有機支撐體之脫模層形成所用之脫模劑列舉為例如由醇酸樹脂、聚烯烴樹脂、胺基甲酸酯樹脂及聚矽氧樹脂所組成之群選出之1種以上之脫模劑。脫模層可藉由例如將含有脫模劑之溶液塗佈於有機支撐體之表面並乾燥而形成。 Further, the organic support may be attached to the side of the resin composition layer, that is, the organic support having the release layer on the side of the coating resin composition (hereinafter, the mold release layer is attached). The organic support of the layer is simply referred to as an organic support). The release agent used for forming the release layer of the organic support having the release layer is, for example, one or more selected from the group consisting of an alkyd resin, a polyolefin resin, a urethane resin, and a polyoxymethylene resin. Release agent. The release layer can be formed, for example, by applying a solution containing a release agent to the surface of the organic support and drying.

附脫模層之有機支撐體亦可使用市售品,列舉為例如具有以醇酸樹脂系脫模劑作為主成分之脫模層之PET薄膜的LINTEC(股)製之「SK-1」、「AL-5」、「AL-7」等。 The "SK-1" manufactured by LINTEC Co., Ltd., which is a PET film having a release layer containing an alkyd-based release agent as a main component, may be used as the organic support having the release layer. "AL-5", "AL-7", etc.

有機支撐體之厚度並無特別限制,較好為5μm~75μm之範圍,更好為10μm~60μm之範圍,又更好為12.5μm~55μm之範圍。又,使用附脫模層之有機支撐 體時,附脫模層之有機支撐體整體之厚度較好為前述範圍內。 The thickness of the organic support is not particularly limited, but is preferably in the range of 5 μm to 75 μm, more preferably in the range of 10 μm to 60 μm, and still more preferably in the range of 12.5 μm to 55 μm. Also, use the organic support with the release layer In the case of the body, the thickness of the entire organic support having the release layer is preferably within the above range.

(樹脂組成物層) (resin composition layer)

樹脂組成物層之厚度並無特別限制。樹脂組成物層之厚度較好為0.5μm~80μm,更好為10μm~60μm。 The thickness of the resin composition layer is not particularly limited. The thickness of the resin composition layer is preferably from 0.5 μm to 80 μm, more preferably from 10 μm to 60 μm.

(接著薄膜之形成步驟) (following the film formation step)

樹脂組成物層所用之樹脂組成物可藉由適當混合已說明之前述成分,且視需要以混練手段(3軸輥、球磨機、珠粒研磨機、砂磨機等)或攪拌手段(超級混練機、行星式混練機等)進行混練或混合而調製。 The resin composition used for the resin composition layer can be appropriately mixed with the aforementioned components, and if necessary, by kneading means (3-axis roll, ball mill, bead mill, sand mill, etc.) or stirring means (super kneading machine) , planetary mixers, etc.) are mixed or mixed to prepare.

具有樹脂組成物層之接著薄膜之製造方法並無特別限制,可藉由例如使樹脂組成物溶解於有機溶劑中而調製樹脂漆料,使用模嘴塗佈器等將該樹脂漆料塗佈於有機支撐體上,使所塗佈之樹脂漆料之塗佈膜乾燥而製作。 The method for producing the adhesive film having the resin composition layer is not particularly limited, and the resin paint can be prepared by dissolving the resin composition in an organic solvent, for example, and applying the resin paint to the resin paint using a die coater or the like. The coating film of the applied resin varnish is dried and produced on the organic support.

調製樹脂漆料時所用之有機溶劑可列舉為例如丙酮、甲基乙基酮及環己酮等酮類,乙酸乙酯、乙酸丁酯、溶纖素乙酸酯、丙二醇單甲基醚乙酸酯及卡必醇乙酸酯等乙酸酯類,溶纖素及丁基卡必醇等卡必醇類,甲苯及二甲苯等芳香族烴類,二甲基甲醯胺、二甲基乙醯胺及N-甲基吡咯啶酮等醯胺系溶劑等。有機溶劑可單獨使用1種,或亦可併用2種以上。 The organic solvent used in the preparation of the resin paint may, for example, be a ketone such as acetone, methyl ethyl ketone or cyclohexanone, ethyl acetate, butyl acetate, cellosolve acetate, propylene glycol monomethyl ether acetate. Acetates such as esters and carbitol acetates, carbitols such as cellosolve and butyl carbitol, aromatic hydrocarbons such as toluene and xylene, dimethylformamide, dimethylacetamidine A guanamine-based solvent such as an amine or N-methylpyrrolidone. The organic solvent may be used singly or in combination of two or more.

樹脂組成物層之形成中由樹脂漆料所成之塗佈膜之乾燥處理可藉加熱、吹熱風等習知之任意適當之乾燥方法實施。藉由該乾燥處理,塗佈膜成為樹脂組成物層。 The drying treatment of the coating film formed of the resin paint in the formation of the resin composition layer can be carried out by any appropriate drying method known in the art such as heating or blowing hot air. By this drying treatment, the coating film becomes a resin composition layer.

該乾燥處理之乾燥條件只要考慮樹脂組成物、樹脂漆料所含之有機溶劑之沸點等而設為任意適當條件即可。乾燥條件只要為例如在80℃~150℃下3分鐘~15分鐘左右即可。 The drying conditions of the drying treatment may be any suitable conditions in consideration of the boiling point of the organic solvent contained in the resin composition or the resin paint. The drying conditions may be, for example, about 3 minutes to 15 minutes at 80 ° C to 150 ° C.

接著薄膜之形成步驟較好使用有機支撐體的長條狀支撐體,以輥對輥之方式進行,亦可以批式方式進行。 Next, the step of forming the film is preferably carried out by using a strip-shaped support of the organic support in the form of a roll-to-roll method, or in a batch manner.

以輥對輥方式之接著薄膜形成步驟具體而言可如下進行:藉由在包含捲出輥及捲取輥之至少2根輥間邊連續輸送張開之長條狀有機支撐體,邊於捲出輥及捲取輥間露出之支撐體之一主面上塗佈樹脂組成物而形成塗佈膜,使所得塗佈膜進行連續乾燥處理而成為樹脂組成物層。 The film forming step in the roll-to-roll mode can be specifically carried out by: continuously conveying the elongated strip-shaped organic support between at least two rolls including the take-up roll and the take-up roll, and winding the roll A resin film is applied to one main surface of the support body exposed between the winding rolls to form a coating film, and the obtained coating film is continuously dried to form a resin composition layer.

據此,可準備於有機支撐體上設有樹脂組成物層之接著薄膜。 According to this, an adhesive film provided with a resin composition layer on the organic support can be prepared.

所準備之接著薄膜暫時儲存時,較好設置與樹脂組成物層之未與有機支撐體接合之側之露出面(亦即,與有機支撐體相反側之面)接合之保護薄膜。該保護薄膜有助於防止樹脂組成物層之污物等之附著或傷痕。保護薄膜可使用例如聚丙烯薄膜、聚乙烯薄膜等。且可使用 由與有機支撐體之材料相同之材料所成之薄膜。保護薄膜之厚度並無特別限制,例如為1μm~40μm。保護薄膜之厚度較好薄於有機支撐體之厚度。 When the film is temporarily stored, it is preferable to provide a protective film which is bonded to the exposed surface of the resin composition layer which is not bonded to the organic support (that is, the surface opposite to the organic support). This protective film contributes to prevention of adhesion or scratches of dirt or the like of the resin composition layer. As the protective film, for example, a polypropylene film, a polyethylene film, or the like can be used. And can be used A film made of the same material as the material of the organic support. The thickness of the protective film is not particularly limited and is, for example, 1 μm to 40 μm. The thickness of the protective film is preferably thinner than the thickness of the organic support.

保護薄膜與接著薄膜之貼合可使用過去習知之層合裝置進行。 The bonding of the protective film to the adhesive film can be carried out using a conventional laminating apparatus.

針對使用已說明之接著薄膜所製造之本實施形態之該配線板及其製造方法加以說明。 The wiring board and the method of manufacturing the same according to the embodiment manufactured using the above-described adhesive film will be described.

[配線板] [wiring board]

針對配線板之構成例,參照圖1、圖2及圖3加以說明。圖1係自配線板之厚度方向之一側觀看之示意俯視圖。圖2係顯示以II-II一點鏈線所示之位置切斷之配線板之切斷端面之示意圖。圖3係用於說明配線板中之第1配線層之構成之示意俯視圖。 A configuration example of the wiring board will be described with reference to Figs. 1, 2, and 3. Fig. 1 is a schematic plan view as seen from one side in the thickness direction of the wiring board. Fig. 2 is a view showing a cut end face of a wiring board cut at a position indicated by a point chain of II-II. 3 is a schematic plan view for explaining a configuration of a first wiring layer in a wiring board.

配線板包含具有樹脂組成物(樹脂組成物層)之硬化物的絕緣層,與至少一部分埋入該絕緣層之線圈狀導電性構造體,且由該線圈狀導電性構造體與朝絕緣層之厚度方向延伸且由該線圈狀導電性構造體包圍之絕緣層中之一部分所構成之電感器元件。 The wiring board includes an insulating layer having a cured product of a resin composition (resin composition layer), and a coil-shaped conductive structure in which at least a part of the insulating layer is embedded, and the coil-shaped conductive structure and the insulating layer are An inductor element composed of a portion of the insulating layer extending in the thickness direction and surrounded by the coil-shaped conductive structure.

本實施形態之配線板所具備之電感器元件可發揮功能之頻率推定為1GHz以上。該電感器元件可發揮功能之頻率較好為1GHz~3GHz。 The frequency at which the inductor element included in the wiring board of the present embodiment can function is estimated to be 1 GHz or more. The frequency at which the inductor element can function is preferably from 1 GHz to 3 GHz.

如圖1及圖2所示,配線板10係所謂的具有增層絕緣層之增層配線板。配線板10具備芯基材20。芯 基材20具有彼此對向之第1主表面20a及第2主表面20b。芯基材20為絕緣性基板。芯基材20亦可為於其厚度內擠入配線等之所謂內層電路基板。 As shown in FIGS. 1 and 2, the wiring board 10 is a so-called build-up wiring board having a build-up insulating layer. The wiring board 10 is provided with a core substrate 20. core The base material 20 has a first main surface 20a and a second main surface 20b that face each other. The core substrate 20 is an insulating substrate. The core substrate 20 may be a so-called inner layer circuit substrate in which wiring or the like is extruded in the thickness thereof.

芯基材20之材料之例列舉為玻璃環氧基板、金屬基板、聚酯基板、聚醯亞胺基板、BT樹脂基板、熱硬化型聚苯醚基板等絕緣性基材。 Examples of the material of the core substrate 20 are an insulating substrate such as a glass epoxy substrate, a metal substrate, a polyester substrate, a polyimide substrate, a BT resin substrate, or a thermosetting polyphenylene ether substrate.

芯基材20具有設置於第1主表面20a上之第1配線層42、設置於第2主表面20b上之外部端子24。第1配線層42及第2配線層44包含複數之配線。圖示例僅顯示構成電感器元件之線圈狀導電性構造體40之配線。外部端子24係用於與未圖示之外部裝置等電性連接之端子。外部端子24可構成為設置於第2主表面20b之配線層之一部分。 The core substrate 20 has a first wiring layer 42 provided on the first main surface 20a and an external terminal 24 provided on the second main surface 20b. The first wiring layer 42 and the second wiring layer 44 include a plurality of wirings. The example of the figure shows only the wiring of the coil-shaped conductive structure 40 constituting the inductor element. The external terminal 24 is a terminal for electrically connecting to an external device or the like (not shown). The external terminal 24 can be configured as a portion of the wiring layer provided on the second main surface 20b.

可構成第1配線層42、第2配線層44、外部端子24、其他配線之導體材料列舉為例如由金、鉑、鈀、銀、銅、鋁、鈷、鉻、鋅、鎳、鈦、鎢、鐵、錫及銦所組成之群選出之1種以上之金屬。第1配線層42、第2配線層44、外部端子24、其他配線可由單金屬構成,亦可由合金構成,合金列舉為由上述之群選出之2種以上之金屬之合金(例如,鎳鉻合金、銅鎳合金及銅鈦合金)。其中,基於廣用性、成本、圖型化容易性等之觀點,較好使用鉻、鎳、鈦、鋁、鋅、金、鈀、銀或銅,或鎳鉻合金、銅鎳合金、銅鈦合金,更好使用鉻、鎳、鈦、鋁、鋅、金、鈀、銀或銅,或鎳鉻合金,又更好使用銅。 The conductor material which can form the first wiring layer 42, the second wiring layer 44, the external terminal 24, and other wirings is, for example, gold, platinum, palladium, silver, copper, aluminum, cobalt, chromium, zinc, nickel, titanium, tungsten. One or more metals selected from the group consisting of iron, tin, and indium. The first wiring layer 42, the second wiring layer 44, the external terminal 24, and other wirings may be made of a single metal or may be made of an alloy, and the alloy may be an alloy of two or more kinds of metals selected from the above group (for example, a nickel-chromium alloy). , copper-nickel alloy and copper-titanium alloy). Among them, based on the viewpoints of versatility, cost, ease of patterning, etc., it is preferred to use chromium, nickel, titanium, aluminum, zinc, gold, palladium, silver or copper, or nickel-chromium alloy, copper-nickel alloy, copper-titanium. Alloys, better use of chromium, nickel, titanium, aluminum, zinc, gold, palladium, silver or copper, or nickel-chromium alloys, and better use of copper.

第1配線層42、第2配線層44、外部端子24、其他配線可為單層構造,亦可為由不同種類之金屬或合金所成之單金屬層或合金層層合2層以上而成之複層構造。第1配線層42、第2配線層44、外部端子24、其他配線為複層構造時,與絕緣層接觸之層較好為鉻、鋅或鈦之單金屬層,或鎳鉻合金之合金層。 The first wiring layer 42 , the second wiring layer 44 , the external terminal 24 , and other wirings may have a single layer structure, or may be formed by laminating two or more single metal layers or alloy layers made of different types of metals or alloys. The layered structure. When the first wiring layer 42, the second wiring layer 44, the external terminal 24, and other wirings have a multi-layer structure, the layer in contact with the insulating layer is preferably a single metal layer of chromium, zinc or titanium, or an alloy layer of a nickel-chromium alloy. .

第1配線層42、第2配線層44、外部端子24、其他配線之厚度係依據期望之多層印刷配線板之設計而定,但一般為3μm~35μm,較好為5μm~30μm。 The thickness of the first wiring layer 42, the second wiring layer 44, the external terminal 24, and other wirings depends on the design of the desired multilayer printed wiring board, but is generally 3 μm to 35 μm, preferably 5 μm to 30 μm.

芯基材20所具有之第1配線層42及外部端子24之厚度並無特別限制。第1配線層42及外部端子24之厚度基於薄型化之觀點,較好為70μm以下,更好為60μm以下,又更好為50μm以下,再更好為40μm以下,最好為30μm以下、20μm以下、15μm以下或10μm以下。外部端子24之厚度下限並無特別限制,但較好為1μm以上,更好為3μm以上,又更好為5μm以上。 The thickness of the first wiring layer 42 and the external terminal 24 included in the core substrate 20 is not particularly limited. The thickness of the first interconnect layer 42 and the external terminal 24 is preferably 70 μm or less, more preferably 60 μm or less, still more preferably 50 μm or less, still more preferably 40 μm or less, and most preferably 30 μm or less and 20 μm from the viewpoint of thinning. Hereinafter, it is 15 μm or less or 10 μm or less. The lower limit of the thickness of the external terminal 24 is not particularly limited, but is preferably 1 μm or more, more preferably 3 μm or more, and still more preferably 5 μm or more.

第1配線層42及外部端子24之線(L)/間隔(S)比並無特別限制,但基於減少表面凹凸獲得平滑性優異之絕緣層之觀點,通常為900/900μm以下,較好為700/700μm以下,更好為500/500μm以下,又更好為300/300μm以下,再更好為200/200μm以下。線/間隔比之下限並無特別限制,但基於樹脂組成物對間隔之埋入良好之觀點,較好為1/1μm以上。 The ratio of the line (L)/interval (S) of the first interconnect layer 42 and the external terminal 24 is not particularly limited. However, from the viewpoint of reducing the surface unevenness and obtaining an insulating layer having excellent smoothness, it is usually 900/900 μm or less, preferably It is 700/700 μm or less, more preferably 500/500 μm or less, still more preferably 300/300 μm or less, and even more preferably 200/200 μm or less. The lower limit of the line/space ratio is not particularly limited, but is preferably 1/1 μm or more from the viewpoint that the resin composition is excellent in the embedding of the interval.

芯基材20列舉為例如使用玻璃布基材環氧樹 脂兩面貼銅積層板之Panasonic(股)製之「R1515A」,藉由使銅層圖型化而作成配線層之配線板。 The core substrate 20 is exemplified by, for example, a glass cloth substrate epoxy tree. "R1515A" manufactured by Panasonic Co., Ltd., which is a double-sided copper-clad laminate, is formed into a wiring layer of a wiring layer by patterning a copper layer.

芯基材20具有將芯基材20自第1主表面20a貫通至第2主表面20b之複數貫穿孔22。貫穿孔22中設置有貫穿孔內配線22a。貫穿孔內配線22a使第1配線層42與外部端子24電性連接。 The core base material 20 has a plurality of through holes 22 that penetrate the core base material 20 from the first main surface 20a to the second main surface 20b. A through-hole inner wiring 22a is provided in the through hole 22. The through-hole wiring 22a electrically connects the first wiring layer 42 and the external terminal 24.

如圖3所示,第1配線層42包含用以構成線圈狀導電性構造體40之渦卷狀之配線部,及與貫穿孔內配線22a電性連接之矩形狀之焊墊42a。圖示例中渦卷狀之配線部包含直線狀部與彎曲成直角之彎曲部與繞開焊墊42a之迂迴部。圖示例中之第1配線層42之渦卷狀之配線部整體之輪廓為略矩形狀,具有自中心側朝其外側逆時針捲繞之形狀。 As shown in FIG. 3, the first interconnect layer 42 includes a spiral-shaped wiring portion for forming the coil-shaped conductive structure 40, and a rectangular pad 42a electrically connected to the through-hole wiring 22a. In the illustrated example, the spiral-shaped wiring portion includes a linear portion and a bent portion bent at a right angle and a bypass portion around the bonding pad 42a. In the example of the first wiring layer 42, the outline of the spiral wiring portion of the first wiring layer 42 has a substantially rectangular shape, and has a shape that is wound counterclockwise from the center side toward the outer side.

設有第1配線層42之芯基材20之第1主表面20a側以覆蓋第1配線層42及自第1配線層42露出之第1主表面20a之方式設置第1絕緣層32。 The first main surface 20a side of the core substrate 20 on which the first wiring layer 42 is provided is provided with the first insulating layer 32 so as to cover the first wiring layer 42 and the first main surface 20a exposed from the first wiring layer 42.

第1絕緣層32由於係源自己說明之接著薄膜之層,故第1配線層42之密封性優異。且第1絕緣層32由於係使用前述接著薄膜形成,故在頻率為1GHz以上之高頻帶(千兆赫帶),尤其是1GHz至3GHz之範圍之磁導率提高,且抑制磁性損失。 Since the first insulating layer 32 is a layer of the film which is described by the source itself, the first wiring layer 42 is excellent in sealing property. Further, since the first insulating layer 32 is formed using the above-described adhesive film, the magnetic permeability in the high frequency band (gigahertz band) having a frequency of 1 GHz or more, particularly in the range of 1 GHz to 3 GHz, is improved, and magnetic loss is suppressed.

第1絕緣層32中設有將第1絕緣層32於其厚度方向貫通之通孔36。 The first insulating layer 32 is provided with a through hole 36 through which the first insulating layer 32 penetrates in the thickness direction.

第1絕緣層32上設有第2配線層44。第2配 線層44包含用以構成線圈狀導電性構造體40之渦卷狀之配線部。圖示例中渦卷狀之配線部包含直線狀部與彎曲成直角之彎曲部。圖示例中之第2配線層44之渦卷狀之配線部整體之輪廓為略矩形狀,具有自中心側朝向其外側逆時針捲繞之形狀。 The second wiring layer 44 is provided on the first insulating layer 32. 2nd match The wire layer 44 includes a spiral-shaped wiring portion for constituting the coil-shaped conductive structural body 40. In the illustrated example, the spiral-shaped wiring portion includes a linear portion and a curved portion bent at right angles. In the example of the present invention, the outline of the spiral wiring portion of the second interconnect layer 44 has a substantially rectangular shape and has a shape that is wound counterclockwise from the center side toward the outer side.

通孔36內設有通孔內配線36a。第2配線層44之渦卷狀配線部中之中心側之一端藉由通孔內配線36a與第1配線層42之渦卷狀配線部中之中心側之一端電性連接。第2配線層44之渦卷狀配線部中之外圍側之另一端藉由通孔內配線36a與第1配線層42之焊墊42a電性連接。因此第2配線層44之渦卷狀配線部中之外圍側之另一端經過通孔內配線36a、焊墊42a、貫穿孔內配線22a與外部端子24電性連接。 A through-hole inner wiring 36a is provided in the through hole 36. One end of the center side of the spiral wiring portion of the second interconnect layer 44 is electrically connected to one end of the center side of the spiral wiring portion of the first wiring layer 42 by the through-hole wiring 36a. The other end of the spiral side wiring portion of the second interconnect layer 44 is electrically connected to the pad 42a of the first interconnect layer 42 via the via inner wiring 36a. Therefore, the other end of the spiral-shaped wiring portion of the second interconnect layer 44 is electrically connected to the external terminal 24 via the via inner wiring 36a, the pad 42a, and the through-hole wiring 22a.

線圈狀導電性構造體40係由第1配線層42之一部分之渦卷狀之配線部、第2配線層44之一部分之渦卷狀之配線部、及使第1配線層42之渦卷狀之配線部與第2配線層44之渦卷狀之配線部電性連接之通孔內配線36a所構成。 The coil-shaped conductive structure 40 is a spiral-shaped wiring portion of a portion of the first wiring layer 42 and a spiral-shaped wiring portion of a portion of the second wiring layer 44, and a spiral shape of the first wiring layer 42. The wiring portion is formed by the through-hole wiring 36a electrically connected to the spiral wiring portion of the second wiring layer 44.

設有第2配線層44之第1絕緣層32中以包覆第2配線層44及自第2配線層44露出之第1絕緣層32之方式設置第2絕緣層34。 The second insulating layer 34 is provided in the first insulating layer 32 in which the second interconnect layer 44 is provided so as to cover the second interconnect layer 44 and the first insulating layer 32 exposed from the second interconnect layer 44.

第2絕緣層34與第1絕緣層32同樣為源自己說明之接著薄膜之層,接著薄膜之樹脂組成物層由於形成絕緣層時之流動性優異,故第2配線層44之密封性優 異。且第2絕緣層34由於係使用前述接著薄膜形成,故在頻率1GHz以上之高頻帶,尤其是1GHz至3GHz之範圍之磁導率提高,且抑制磁性損失。 Similarly to the first insulating layer 32, the second insulating layer 34 is a layer of the film which is described by the source itself. Then, the resin composition layer of the film is excellent in fluidity when the insulating layer is formed, so that the sealing property of the second wiring layer 44 is excellent. different. Further, since the second insulating layer 34 is formed using the above-described adhesive film, the magnetic permeability in the high frequency band of 1 GHz or higher, particularly in the range of 1 GHz to 3 GHz, is improved, and the magnetic loss is suppressed.

第1絕緣層32及第2絕緣層34構成可視為一體絕緣層之絕緣部30。因此線圈狀導電性構造體40係以至少一部分埋入絕緣部30之方式設置。亦即,本實施形態之配線板10中,電感器元件係以線圈狀導電性構造體40、與朝絕緣部30之厚度方向延伸且由線圈狀導電性構造體40所包圍之絕緣部30中之一部分的芯部所構成。 The first insulating layer 32 and the second insulating layer 34 constitute an insulating portion 30 which can be regarded as an integral insulating layer. Therefore, the coil-shaped conductive structure 40 is provided so that at least a part of the coiled conductive structure 40 is buried in the insulating portion 30. In the wiring board 10 of the present embodiment, the inductor element is formed of the coil-shaped conductive structure 40 and the insulating portion 30 which is extended in the thickness direction of the insulating portion 30 and surrounded by the coil-shaped conductive structure 40. A part of the core is formed.

本實施形態係說明線圈狀導電性構造體40包含第1配線層42及第2配線層44之2層配線層之例,但亦可以3層以上之配線層(及3層以上之增層絕緣層)構成線圈狀導電性構造體40。該情況下,以夾持於最上層之配線層與最下層之配線層間之方式配置之未圖示之配線層之渦卷狀配線部,其一端與最靠近最上層側配置之配線層之渦卷狀配線部之任一端部電性連接,另一端與最靠近最下層側配置之配線層之渦卷狀配線部之任一端部電性連接。 In the present embodiment, the coil-shaped conductive structure 40 includes two wiring layers of the first wiring layer 42 and the second wiring layer 44. However, three or more wiring layers (and three or more layers of insulating layers) may be used. The layer) constitutes a coil-shaped conductive structure 40. In this case, the spiral wiring portion of the wiring layer (not shown) disposed between the wiring layer of the uppermost layer and the wiring layer of the lowermost layer is vortexed at one end and the wiring layer disposed closest to the uppermost layer side. Either end portion of the rolled wiring portion is electrically connected, and the other end is electrically connected to either end portion of the spiral wiring portion of the wiring layer disposed closest to the lowermost layer side.

依據本實施形態之該電路基板,由於以前述接著薄膜形成絕緣層,故可提高形成之絕緣層之磁導率,結果可提高擠入電路基板之電感器元件之L值及Q值。 According to the circuit board of the present embodiment, since the insulating layer is formed by the adhesive film, the magnetic permeability of the formed insulating layer can be improved, and as a result, the L value and the Q value of the inductor element extruded into the circuit board can be improved.

[配線板之製造方法] [Manufacturing method of wiring board]

以下,針對本實施形態之該配線板之製造方法參照圖 2加以說明。 Hereinafter, a method of manufacturing the wiring board according to the embodiment will be described. 2 to explain.

本實施形態之該配線板之製造方法係具有含有第1絕緣層及第2絕緣層之絕緣部、與至少一部分埋入該絕緣部中之線圈狀導電性構造體,且包含由該線圈狀導電性構造體與絕緣部中之一部分構成之電感器元件之配線板之製造方法,本實施形態包含下述步驟:準備接著薄膜、及設有第1配線層之芯基材之步驟,將接著薄膜之樹脂組成物層層合於芯基材上之步驟,使樹脂組成物層熱硬化而形成第1絕緣層之步驟,於第1絕緣層上形成通孔之步驟,對形成有通孔之第1絕緣層進行粗化處理之步驟,於第1絕緣層上形成第2配線層,且形成使第1配線層與第2配線層電性連接之通孔內配線之步驟,進而將本實施形態之該接著薄膜層合於形成有第2配線層及通孔內配線之第1絕緣層上,並經熱硬化而形成第2絕緣層之步驟,形成包含含有第1配線層之一部分與第2配線層之一部分與通孔內配線之線圈狀導電性構造體、及朝絕緣部之厚度方向延伸且由線圈狀導電性構造體包圍之絕緣部之一部分之電感器元件之步驟。 The method for manufacturing a wiring board according to the present embodiment includes an insulating portion including a first insulating layer and a second insulating layer, and a coil-shaped conductive structure in which at least a portion is embedded in the insulating portion, and includes a coil-shaped conductive body. In the method of manufacturing a wiring board of an inductor element comprising one of a structural structure and an insulating portion, the present embodiment includes the steps of: preparing a subsequent film and a core substrate provided with the first wiring layer; a step of laminating the resin composition layer on the core substrate, thermally curing the resin composition layer to form the first insulating layer, forming a through hole in the first insulating layer, and forming a through hole a step of roughening the insulating layer, forming a second wiring layer on the first insulating layer, and forming a wiring in the via hole electrically connecting the first wiring layer and the second wiring layer, and further implementing the embodiment The adhesive film is laminated on the first insulating layer on which the second wiring layer and the via wiring are formed, and is thermally cured to form a second insulating layer, and includes a portion including the first wiring layer and the second portion. One part of the wiring layer The through-hole of the coiled conductive wire structure, and a step of extending a portion of the inductor element surrounds the insulating portion of a coil-shaped conductive structure in the thickness direction of the insulating portion.

首先如已說明般,準備設有於第1主表面20a上所設之第1配線層42、於第2主表面20b上所設之外部端子24、貫穿孔22、及貫穿孔內配線22a之芯基材(內層電路基板)20及接著薄膜。 First, as described above, the first wiring layer 42 provided on the first main surface 20a, the external terminal 24 provided on the second main surface 20b, the through hole 22, and the through-hole wiring 22a are prepared. Core substrate (inner layer circuit substrate) 20 and subsequent film.

(第1絕緣層之形成步驟) (Step of forming the first insulating layer)

接著形成第1絕緣層32。首先進行以與芯基材之第1配線層42接觸之方式層合接著薄膜之樹脂組成物層之層合步驟。 Next, the first insulating layer 32 is formed. First, a lamination step of laminating the resin composition layer of the film in contact with the first wiring layer 42 of the core substrate is performed.

層合步驟之條件並無特別限制,可採用使用接著薄膜形成絕緣層(增層絕緣層)時使用之習知條件。例如,可藉由自接著薄膜之有機支撐體側壓著經加熱之不銹鋼鏡面板等金屬板而進行。該情況下,為了不直接壓著金屬板,較好以使接著薄膜充分追隨芯基材20表面之凹凸之方式,經由由耐熱橡膠等所成之彈性構件進行壓著。壓著溫度較好為70℃~140℃之範圍,壓著壓力較好為1kgf/cm2~11kgf/cm2(0.098MPa~1.079MPa)之範圍,壓著時間較好為5秒~3分鐘之範圍。 The conditions of the laminating step are not particularly limited, and conventional conditions used in forming an insulating layer (addition insulating layer) using a film may be employed. For example, it can be carried out by pressing a metal plate such as a heated stainless steel mirror panel from the side of the organic support of the film. In this case, in order to prevent the unevenness of the surface of the core base material 20 so as not to directly press the metal plate, it is preferable to press the elastic member made of a heat-resistant rubber or the like. The pressing temperature is preferably in the range of 70 ° C to 140 ° C, and the pressing pressure is preferably in the range of 1 kgf / cm 2 to 11 kgf / cm 2 (0.098 MPa to 1.079 MPa), and the pressing time is preferably 5 seconds to 3 minutes. The scope.

此外,層合步驟較好在20mmHg(26.7hPa)以下之減壓下進行。層合步驟可使用市售之真空層合機進行。市售之真空層合機列舉為例如名機製作所(股)製之真空加壓式層合機、NICHIGO MORTON(股)製造之真空塗佈機等。 Further, the laminating step is preferably carried out under reduced pressure of 20 mmHg (26.7 hPa) or less. The lamination step can be carried out using a commercially available vacuum laminator. Commercially available vacuum laminating machines are, for example, vacuum press laminators manufactured by Nippon Seisakusho Co., Ltd., vacuum coaters manufactured by NICHIGO MORTON Co., Ltd., and the like.

層合步驟結束後,亦可實施使層合於芯基材20上之接著薄膜加熱及加壓處理之平滑化步驟。 After the lamination step is completed, a smoothing step of heating and pressurizing the film which is laminated on the core substrate 20 may be carried out.

平滑化步驟一般係在常壓(大氣壓)下利用加熱之金屬板或金屬輥,藉加熱及加壓處理層合於芯基材20上之接著薄膜而進行。加熱及加壓處理之條件可使用與上述層合步驟之條件相同之條件。 The smoothing step is generally carried out by a heated metal sheet or a metal roll under normal pressure (atmospheric pressure) by heat and pressure treatment of a film which is laminated on the core substrate 20. The conditions of the heating and pressurization treatment may be the same as those of the above-mentioned lamination step.

層合步驟及平滑化步驟亦可使用同一真空層 合機連續進行。 The same vacuum layer can also be used for the lamination step and the smoothing step The machine is continuously operated.

又,在前述層合步驟或前述平滑化步驟實施後之任意時點進行剝離源自接著薄膜之有機支撐體之步驟。剝離有機支撐體之步驟可利用例如市售之自動剝離裝置機械地進行。 Further, the step of peeling off the organic support derived from the film is carried out at any point after the lamination step or the smoothing step. The step of peeling off the organic support can be carried out mechanically using, for example, a commercially available automatic peeling device.

接著,實施使層合於芯基材20上之樹脂組成物層熱硬化形成絕緣層(增層絕緣層)之熱硬化步驟。 Next, a thermal hardening step of thermally curing the resin composition layer laminated on the core substrate 20 to form an insulating layer (addition insulating layer) is carried out.

熱硬化步驟之條件並無特別限制,可使用形成多層印刷配線板之絕緣層時通常採用之條件。 The conditions of the heat hardening step are not particularly limited, and the conditions generally employed in forming the insulating layer of the multilayer printed wiring board can be used.

熱硬化步驟之條件可依據樹脂組成物層所用之樹脂組成物之組成等設為任意較佳之條件。熱硬化步驟之條件可為例如將硬化溫度設為120℃~240℃之範圍(較好為150℃~210℃之範圍,更好為170℃~190℃之範圍),將硬化時間設為5分鐘~90分鐘之範圍(較好為10分鐘~75分鐘,更好為15分鐘~60分鐘)。 The conditions of the heat hardening step can be set to any preferable conditions depending on the composition of the resin composition used for the resin composition layer and the like. The curing step may be, for example, a curing temperature of 120 ° C to 240 ° C (preferably in the range of 150 ° C to 210 ° C, more preferably in the range of 170 ° C to 190 ° C), and a hardening time of 5 The range of minutes to 90 minutes (preferably 10 minutes to 75 minutes, preferably 15 minutes to 60 minutes).

實施熱硬化步驟前,亦可實施以比硬化溫度低之溫度預加熱樹脂組成物層之步驟。實施熱硬化步驟前,亦可以例如50℃以上未達120℃(較好60℃以上110℃以下,更好70℃以上100℃以下)之溫度預加熱樹脂組成物層5分鐘以上(較好為5分鐘~150分鐘,更好為15分鐘~120分鐘)。預加熱較好在大氣壓下(常壓下)進行。 The step of preheating the resin composition layer at a temperature lower than the curing temperature may be carried out before the thermal hardening step. Before the thermal hardening step, the resin composition layer may be preheated for, for example, 50 ° C or more and less than 120 ° C (preferably 60 ° C or more and 110 ° C or less, more preferably 70 ° C or more and 100 ° C or less) for 5 minutes or more (preferably 5 minutes to 150 minutes, preferably 15 minutes to 120 minutes). The preheating is preferably carried out under atmospheric pressure (at normal pressure).

利用以上步驟可形成設於芯基材20上之第1絕緣層32。又,藉由對形成有絕緣層之芯基材20重複1次以上之前述層合步驟及前述熱硬化步驟以及後述之配線 層形成步驟,可形成包含設於第1絕緣層32上之第2絕緣層34之進而積層之絕緣層之絕緣部30。 The first insulating layer 32 provided on the core substrate 20 can be formed by the above steps. Moreover, the lamination step, the thermal curing step, and the wiring described later are repeated one or more times on the core substrate 20 on which the insulating layer is formed. In the layer forming step, the insulating portion 30 including the insulating layer which is further laminated on the second insulating layer 34 provided on the first insulating layer 32 can be formed.

此外,於芯基材20上形成第1絕緣層32之步驟亦可使用一般真空熱壓機進行。例如,可使用經加熱之SUS板等金屬板自有機支撐體側壓著而進行。壓著條件通常係將減壓度設為1×10-2MPa以下,較好為1×10-3MPa以下之減壓下。加熱及加壓亦可以1階段進行,但基於控制樹脂滲出之觀點,較好以2階段以上之步驟,改變各自之壓著條件進行。例如,於第1階段之壓著條件將溫度設為70℃~150℃,壓力設為1kgf/cm2~15kgf/cm2之範圍,第2階段之壓著條件將溫度設為150℃~200℃,壓力設為1kgf/cm2~40kgf/cm2之範圍而進行較佳。各階段之時間較好進行30分鐘~120分鐘。市售之真空加壓機列舉為例如名機製作所(股)製之「MNPC-V-750-5-200」、北川精機(股)製之「VH1-1603」等。 Further, the step of forming the first insulating layer 32 on the core substrate 20 can also be carried out using a general vacuum hot press. For example, it can be carried out by pressing a metal plate such as a heated SUS plate from the side of the organic support. The pressing condition is usually such that the degree of pressure reduction is 1 × 10 -2 MPa or less, preferably 1 × 10 -3 MPa or less. The heating and pressurization may be carried out in one step. However, from the viewpoint of controlling the bleeding of the resin, it is preferred to carry out the steps of two or more stages and change the respective pressing conditions. For example, in the first stage, the pressing conditions are 70°C to 150°C, the pressure is in the range of 1kgf/cm 2 to 15kgf/cm 2 , and the pressing condition in the second stage is 150°C to 200°. At °C, the pressure is preferably in the range of 1 kgf/cm 2 to 40 kgf/cm 2 . The time of each stage is preferably 30 minutes to 120 minutes. The commercially available vacuum presses are exemplified by "MNPC-V-750-5-200" manufactured by Nippon Seiki Co., Ltd., and "VH1-1603" manufactured by Kitagawa Seiki Co., Ltd., and the like.

(通孔之形成步驟) (Step of forming a through hole)

於形成之第1絕緣層32上形成通孔36。通孔36成為用以電性連接第1配線層42與第2配線層44之路徑。通孔36考慮第1絕緣層32之特性,可藉由使用鑽孔機、雷射、電漿等習知方法形成。例如,於該時點殘留保護薄膜時,藉由透過保護薄膜對第1絕緣層32照射雷射光,亦可形成通孔36。 A through hole 36 is formed in the formed first insulating layer 32. The via hole 36 serves as a path for electrically connecting the first wiring layer 42 and the second wiring layer 44. The through hole 36 is formed by a conventional method such as a drill, a laser, or a plasma, in consideration of the characteristics of the first insulating layer 32. For example, when the protective film is left at this time, the first insulating layer 32 is irradiated with the laser light through the protective film, and the through hole 36 can be formed.

通孔36之形成可使用之雷射光源例舉為例如 二氧化碳雷射、YAG雷射、準分子雷射等。其中,基於加工速度、成本之觀點,以二氧化碳雷射較佳。 The laser light source that can be used to form the through hole 36 is exemplified by, for example. Carbon dioxide laser, YAG laser, excimer laser, etc. Among them, based on processing speed and cost, it is preferable to use carbon dioxide laser.

通孔36之形成可使用市售之雷射裝置進行。市售之二氧化碳雷射裝置列舉為例如HITACHI VIA MECHANICS(股)製之「LC-2E21B/1C」、三菱電機(股)製之「ML605GTWII」、松下熔接系統(股)製之基板穿孔雷射加工機。 The formation of the through holes 36 can be performed using a commercially available laser device. The commercially available carbon dioxide laser device is exemplified by "LC-2E21B/1C" manufactured by HITACHI VIA MECHANICS Co., Ltd., "ML605GTWII" manufactured by Mitsubishi Electric Corporation, and Panasonic splicing system (shared) substrate perforated laser processing. machine.

(粗化步驟) (roughening step)

接著對形成通孔36之第1絕緣層32進行粗化處理之粗化步驟。粗化步驟之順序、條件並無特別限制,可採用多層印刷配線板之製造方法時通常使用之習知順序、條件。粗化步驟可藉由例如依序實施膨潤液進行之膨潤處理、氧化劑之粗化處理、中和液之中和處理而粗化處理第1絕緣層32。 Next, a roughening step of roughening the first insulating layer 32 forming the via hole 36 is performed. The order and conditions of the roughening step are not particularly limited, and conventional procedures and conditions which are generally used in the production method of a multilayer printed wiring board can be employed. In the roughening step, the first insulating layer 32 can be roughened by, for example, a swelling treatment by a swelling liquid, a roughening treatment of an oxidizing agent, and a neutralization treatment.

粗化步驟中可使用之膨潤液並無特別限制,列舉為鹼溶液、界面活性劑溶液等,較好為鹼溶液。膨潤液之鹼溶液更好為氫氧化鈉溶液、氫氧化鉀溶液。市售之膨潤液列舉為例如日本ATOTECH(股)製之「Swelling Dip Securiganth P」、「Swelling Dip Securiganth SBU」等。 The swelling liquid which can be used in the roughening step is not particularly limited, and examples thereof include an alkali solution, a surfactant solution and the like, and an alkali solution is preferred. The alkali solution of the swelling liquid is preferably a sodium hydroxide solution or a potassium hydroxide solution. Commercially available swelling liquids are, for example, "Swelling Dip Securiganth P" manufactured by ATOTECH Co., Ltd., "Swelling Dip Securiganth SBU", and the like.

膨潤液之膨潤處理並無特別限制,例如可將設有第1絕緣層32之芯基材20浸漬在30℃~90℃之膨潤液中1分鐘~20分鐘而進行。基於使構成第1絕緣層32之樹脂之膨潤抑制在適度程度之觀點,較好將第1絕緣層 32浸漬在40℃~80℃之膨潤液中5分鐘~15分鐘。 The swelling treatment of the swelling liquid is not particularly limited. For example, the core substrate 20 provided with the first insulating layer 32 may be immersed in a swelling liquid at 30 ° C to 90 ° C for 1 minute to 20 minutes. It is preferable to use the first insulating layer from the viewpoint of suppressing the swelling of the resin constituting the first insulating layer 32 to an appropriate degree. 32 is immersed in a swelling solution at 40 ° C ~ 80 ° C for 5 minutes ~ 15 minutes.

氧化劑之粗化處理中可使用之氧化劑並無特別限制,列舉為例如使過錳酸鉀或過錳酸鈉溶解於氫氧化鈉水溶液中而成之鹼性過錳酸溶液。利用鹼性過錳酸溶液等氧化劑之粗化處理較好將第1絕緣層32浸漬於加熱至60℃~80℃之氧化劑溶液中10分鐘~30分鐘而進行。且,鹼性過錳酸溶液中之過錳酸鹽濃度較好設為5質量%~10質量%。市售之氧化劑列舉為例如日本ATOTECH(股)製之「Concentrate‧Compact P」、「Dosing Solution Securiganth P」等鹼性過錳酸溶液。 The oxidizing agent which can be used in the roughening treatment of the oxidizing agent is not particularly limited, and examples thereof include an alkaline permanganic acid solution obtained by dissolving potassium permanganate or sodium permanganate in an aqueous sodium hydroxide solution. The first insulating layer 32 is preferably immersed in an oxidizing agent solution heated to 60 ° C to 80 ° C for 10 minutes to 30 minutes by roughening treatment with an oxidizing agent such as an alkaline permanganic acid solution. Further, the permanganate concentration in the alkaline permanganic acid solution is preferably from 5% by mass to 10% by mass. The oxidizing agent which is commercially available is, for example, an alkaline permanganic acid solution such as "Concentrate‧Compact P" and "Dosing Solution Securiganth P" manufactured by ATOTECH Co., Ltd., Japan.

中和處理可使用之中和液較好為酸性水溶液,市售品列舉為例如日本ATOTECH(股)製之「Reduction Solution Securiganth P」。利用中和液之中和處理可藉由將經氧化劑溶液進行粗化處理之處理面浸漬於30℃~80℃之中和液中5分鐘~30分鐘而進行。基於作業性等之觀點,較好為將經氧化劑溶液進行粗化處理之第1絕緣層32浸漬於40℃~70℃之中和液中5分鐘~20分鐘之方法。 The neutralizing liquid which can be used for the neutralization treatment is preferably an acidic aqueous solution, and the commercially available product is, for example, "Reduction Solution Securiganth P" manufactured by ATOTECH Co., Ltd., Japan. The neutralizing treatment by the neutralization liquid can be carried out by immersing the treated surface subjected to the roughening treatment with the oxidizing agent solution in 30 ° C to 80 ° C and in the liquid for 5 minutes to 30 minutes. From the viewpoint of workability and the like, the first insulating layer 32 which has been subjected to the roughening treatment with the oxidizing agent solution is preferably immersed in a liquid at 40 ° C to 70 ° C for 5 minutes to 20 minutes.

如上述說明之粗化步驟亦可兼具用以進行形成於第1絕緣層32上之通孔36之膠渣去除之所謂除膠渣步驟。 The roughening step as described above may also be a so-called desmear step for removing the slag of the through holes 36 formed in the first insulating layer 32.

且亦可與前述粗化步驟另外對通孔36實施除膠渣步驟。又,該除膠渣步驟可為濕式除膠渣步驟,亦可為乾式除膠渣步驟。 Further, the through-hole 36 may be subjected to a desmear step in addition to the aforementioned roughening step. Moreover, the desmear step may be a wet desmear step or a dry desmear step.

除膠渣步驟之具體步驟並無特別限制,例如可採用形成多層印刷配線板之絕緣層時通常使用之習知步驟、條件。乾式除膠渣步驟之例列舉為電漿處理等,濕式除膠渣步驟之例列舉為例如依序進行與前述粗化步驟相同之膨潤液之膨潤處理、氧化劑之處理及中和液之處理之方法。 The specific steps of the desmear step are not particularly limited, and for example, conventional steps and conditions which are generally used when forming an insulating layer of a multilayer printed wiring board can be employed. Examples of the dry type of desmear are exemplified by plasma treatment, and the wet type of desmear is exemplified by, for example, swell treatment of the same swelling solution as the roughening step, treatment of an oxidizing agent, and treatment of a neutralizing liquid. The method.

(第2配線層之形成) (Formation of the second wiring layer)

接著於進行粗化步驟(及除膠渣步驟)之第1絕緣層32上形成第2配線層44。 Next, the second wiring layer 44 is formed on the first insulating layer 32 where the roughening step (and the desmear step) is performed.

第2配線層44可藉由鍍敷而形成。第2配線層44可藉由例如包含無電解鍍敷步驟、遮罩圖型形成步驟、電解鍍敷步驟、快速蝕刻步驟之半添加法、全添加法等過去習知之技術形成,可形成為包含期望之配線圖型之配線層。又,藉由該第2配線層44之形成步驟,於通孔36內一併形成通孔內配線36a。 The second wiring layer 44 can be formed by plating. The second wiring layer 44 can be formed by, for example, a conventionally known technique including an electroless plating step, a mask pattern forming step, an electrolytic plating step, a rapid etching step, a full addition method, or the like, and can be formed to include The wiring layer of the desired wiring pattern. Further, in the step of forming the second interconnect layer 44, the via-hole wiring 36a is collectively formed in the via hole 36.

第1絕緣層32為增層絕緣層,第2配線層44為增層配線層之增層時,本實施形態之配線板中進而需要1層以上之增層時,只要進而重複實施1次以上之自前述第1絕緣層32之形成步驟至前述第2配線層44之形成步驟之已說明之一連串步驟即可。 When the first insulating layer 32 is a build-up insulating layer and the second interconnect layer 44 is a build-up layer of the build-up wiring layer, when the wiring layer of the present embodiment further requires one or more layers, it is necessary to repeat the above-mentioned one or more times. One of the series of steps from the step of forming the first insulating layer 32 to the step of forming the second wiring layer 44 may be described.

(第2絕緣層之形成) (Formation of the second insulating layer)

接著,於第2配線層44及形成通孔內配線36a之第 1絕緣層32上形成第2絕緣層34。第2絕緣層34只要以使用與已說明之包含接著薄膜之層合步驟、平滑化步驟、熱硬化步驟之第1絕緣層32之形成步驟相同之材料,以相同步驟形成即可。 Next, in the second wiring layer 44 and the formation of the via inner wiring 36a A second insulating layer 34 is formed on the insulating layer 32. The second insulating layer 34 may be formed in the same step by using the same material as the step of forming the first insulating layer 32 including the laminating step, the smoothing step, and the thermal curing step of the bonding film.

藉由以上之步驟,可製造具有至少一部分埋入絕緣部30中之線圈狀導電性構造體40,且包含含有第1配線層42之一部分與第2配線層44之一部分及通孔內配線36a之線圈狀導電性構造體40、與朝絕緣部30之厚度方向延伸且由線圈狀導電性構造體40包圍之絕緣部30中之一部分之電感器元件的配線板10。 By the above steps, the coil-shaped conductive structure 40 having at least a part of the buried insulating portion 30 can be manufactured, and includes a portion including the first wiring layer 42 and a portion of the second wiring layer 44 and the via wiring 36a. The coil-shaped conductive structure 40 and the wiring board 10 of the inductor element which is one of the insulating portions 30 which are extended in the thickness direction of the insulating portion 30 and surrounded by the coil-shaped conductive structure 40.

若使用本發明之接著薄膜,則尤其可提高頻率為1GHz至3GHz之範圍之磁導率,可降低磁性損失,且可形成絕緣性之信賴性優異之絕緣層,故可以更簡易之步驟提供包含以不成為空芯構造之絕緣層之一部分構成之芯部,製作擠入更高性能之高頻帶區域用電感器元件之配線板。 When the adhesive film of the present invention is used, the magnetic permeability in the range of 1 GHz to 3 GHz can be particularly improved, the magnetic loss can be reduced, and an insulating layer excellent in insulation reliability can be formed, so that it can be provided in an easier step. A wiring board formed of a part of an insulating layer which is not a hollow core structure is used to fabricate a wiring board in which an inductor element for a high-frequency band region of higher performance is extruded.

[配線板之使用樣態] [Use pattern of wiring board]

本實施形態之配線板可使用作為用以搭載半導體晶片等電子構件之配線板。且使用該配線板可製造各種樣態之半導體裝置。包含該配線板之半導體裝置可使用於電氣製品(例如,電腦、行動電話、數位相機及電視等)及交通工具(例如,機車、汽車、電車、船舶及飛機等)等。 As the wiring board of the present embodiment, a wiring board for mounting an electronic component such as a semiconductor wafer can be used. And the wiring board can be used to manufacture various types of semiconductor devices. The semiconductor device including the wiring board can be used for electrical products (for example, computers, mobile phones, digital cameras, televisions, etc.) and vehicles (for example, locomotives, automobiles, electric cars, ships, airplanes, etc.).

[實施例] [Examples]

以下,基於實施例及比較例更具體說明本發明,但本發明並不受限於以下實施例。又,以下記載中之「份」意指「質量份」。 Hereinafter, the present invention will be more specifically described based on examples and comparative examples, but the present invention is not limited to the following examples. In addition, the "parts" in the following description means "parts by mass".

<實施例1> <Example 1>

使液狀雙酚A型環氧樹脂(環氧當量190,比重1.2g/cm3,三菱化學(股)製之「jER828EL」)20份、聯苯型環氧樹脂(環氧當量291,比重1.2g/cm3,日本化藥(股)製之「NC3000H」)65份、苯氧樹脂(重量平均分子量38000,比重1.2g/cm3,三菱化學(股)製之「YX6954」,不揮發成分30質量%之甲基乙基酮(以下稱為「MEK」)與環己酮之1:1溶液)30份邊於MEK 22.5份、環己酮22.5份中攪拌邊加熱溶解。接著,混合酚酚醛清漆系硬化劑(DIC(股)製之「LA-7054」(含有三嗪骨架之酚系硬化劑)之不揮發成分60%之MEK溶液、酚性羥基當量124、比重1.2g/cm3)40份、硬化促進劑(四國化成工業(股)製之「2E4MZ」、比重1.1g/cm3)0.1份、無機填充材(平均粒徑0.5μm,比重2.2g/cm3,以胺基矽烷系偶合劑(信越化學工業(股)製之「KBM573」)處理ADOMTECH(股)製之「SO-C2」而成之二氧化矽)50份、磁性填料(EPSON ATMIX(股)製之「AW2-08PF3F」、Fe-Cr-Si系合金(非晶型),平均粒徑3.0μm,比重7.0g/cm3)440份,以高速旋轉混練機均勻分散,調製樹脂漆料。接著,以使乾燥後之樹脂組成 物層之厚度成為50μm之方式,以模嘴塗佈器將該樹脂漆料塗佈於支撐體的聚對苯二甲酸乙二酯(以下稱為「PET」)薄膜(厚度38μm)上,在75℃~120℃(平均100℃)下,以使樹脂組成物層中之殘留溶劑量成為約0.4質量%之方式乾燥7分鐘。接著邊於樹脂組成物層之表面貼合厚度15μm之聚丙烯薄膜邊捲成滾筒狀,作成滾筒狀接著薄膜。以使所得滾筒狀接著薄膜之長度方向之長度成為507mm之方式切斷,藉此獲得507mm×336mm邊長之薄片狀接著薄膜。 20 parts of liquid bisphenol A type epoxy resin (epoxy equivalent 190, specific gravity 1.2 g/cm 3 , "jER828EL" manufactured by Mitsubishi Chemical Corporation), biphenyl type epoxy resin (epoxy equivalent 291, specific gravity) 1.2g/cm 3 , "NC3000H" manufactured by Nippon Kayaku Co., Ltd., 65 parts, phenoxy resin (weight average molecular weight 38000, specific gravity 1.2g/cm 3 , "YX6954" manufactured by Mitsubishi Chemical Corporation), non-volatile 30 parts by weight of 30% by mass of methyl ethyl ketone (hereinafter referred to as "MEK") and cyclohexanone in a 1:1 solution), while dissolving 30 parts of MEK in 22.5 parts and 22.5 parts of cyclohexanone, the mixture was heated and dissolved. Next, a 60% MEK solution, a phenolic hydroxyl equivalent of 124, and a specific gravity of 1.2, which are nonvolatile components of "LA-7054" (a phenolic hardener containing a triazine skeleton) manufactured by DIC Co., Ltd., are mixed. g/cm 3 ) 40 parts, hardening accelerator ("2E4MZ" manufactured by Shikoku Chemicals Co., Ltd., specific gravity 1.1g/cm 3 ) 0.1 parts, inorganic filler (average particle size 0.5 μm, specific gravity 2.2 g/cm) 3 , an amine-based decane-based coupling agent ("KBM573" manufactured by Shin-Etsu Chemical Co., Ltd.) is used to process 50 parts of SOD-made "SO-C2" cerium oxide), magnetic filler (EPSON ATMIX ( "AW2-08PF3F", Fe-Cr-Si alloy (amorphous), 440 parts of average particle size 3.0 μm, specific gravity 7.0 g/cm 3 ), uniformly dispersed by a high-speed rotary kneading machine to prepare resin paint material. Next, the resin paint was applied to the support of polyethylene terephthalate (hereinafter referred to as "PET" by a die coater so that the thickness of the dried resin composition layer was 50 μm. The film (thickness: 38 μm) was dried for 7 minutes at 75 ° C to 120 ° C (average 100 ° C) so that the amount of residual solvent in the resin composition layer was about 0.4% by mass. Then, a polypropylene film having a thickness of 15 μm was bonded to the surface of the resin composition layer, and rolled into a roll shape to form a roll-shaped film. The sheet-like adhesive film having a side length of 507 mm × 336 mm was obtained by cutting the length of the obtained roll-shaped succeeding film in the longitudinal direction to 507 mm.

<實施例2> <Example 2>

實施例1中,除了將無機填充材(平均粒徑0.5μm,比重2.2g/cm3,以胺基矽烷系偶合劑(信越化學工業(股)製之「KBM573」)處理ADOMTECH(股)製之「SO-C2」而成之二氧化矽)之量設為160份,將磁性填料(EPSON ATMIX(股)製之「AW2-08PF3F」,平均粒徑3.0μm,比重7.0g/cm3)之量設為350份以外,餘與實施例1同樣獲得接著薄膜。 In the first embodiment, an inorganic filler (having an average particle diameter of 0.5 μm and a specific gravity of 2.2 g/cm 3 , an amine decane-based coupling agent ("KBM573" manufactured by Shin-Etsu Chemical Co., Ltd.) was used to process ADOMTECH. The amount of "SO-C2" is set to 160 parts, and the magnetic filler ("AW2-08PF3F" made by EPSON ATMIX) has an average particle diameter of 3.0 μm and a specific gravity of 7.0 g/cm 3 . The film was obtained in the same manner as in Example 1 except that the amount was changed to 350 parts.

<實施例3> <Example 3>

實施例1中,除了將無機填充材(平均粒徑0.5μm,比重2.2g/cm3,以胺基矽烷系偶合劑(信越化學工業(股)製之「KBM573」)處理ADOMTECH(股)製之「SO-C2」而成之二氧化矽)之量設為90份,將磁性填料(EPSON ATMIX (股)製之「AW2-08PF3F」,平均粒徑3.0μm,比重7.0g/cm3)之量設為290份以外,餘與實施例1同樣獲得接著薄膜。 In the first embodiment, an inorganic filler (having an average particle diameter of 0.5 μm and a specific gravity of 2.2 g/cm 3 , an amine decane-based coupling agent ("KBM573" manufactured by Shin-Etsu Chemical Co., Ltd.) was used to process ADOMTECH. The amount of "SO-C2" is set to 90 parts, and the magnetic filler ("AW2-08PF3F" made by EPSON ATMIX) has an average particle diameter of 3.0 μm and a specific gravity of 7.0 g/cm 3 . The film was obtained in the same manner as in Example 1 except that the amount was 290 parts.

<實施例4> <Example 4>

實施例1中,除了將無機填充材(平均粒徑0.5μm,比重2.2g/cm3,以胺基矽烷系偶合劑(信越化學工業(股)製之「KBM573」)處理ADOMTECH(股)製之「SO-C2」而成之二氧化矽)之量設為40份,將磁性填料(EPSON ATMIX(股)製之「AW2-08PF3F」,平均粒徑3.0μm,比重7.0g/cm3)之量設為240份以外,餘與實施例1同樣獲得接著薄膜。 In Example 1, except that the inorganic filler (average particle diameter of 0.5 m, specific gravity of 2.2g / cm 3, to amine Silane coupling agent (Shin-Etsu Chemical (shares) made of "KBM573") process ADOMTECH (shares) manufactured The amount of "SO-C2" is set to 40 parts, and the magnetic filler ("AW2-08PF3F" made by EPSON ATMIX) has an average particle diameter of 3.0 μm and a specific gravity of 7.0 g/cm 3 . The film was obtained in the same manner as in Example 1 except that the amount was changed to 240 parts.

<實施例5> <Example 5>

實施例1中,除了將無機填充材(平均粒徑0.5μm,比重2.2g/cm3,以胺基矽烷系偶合劑(信越化學工業(股)製之「KBM573」)處理ADOMTECH(股)製之「SO-C2」而成之二氧化矽)之量設為140份,將磁性填料(EPSON ATMIX(股)製之「AW2-08PF3F」,平均粒徑3.0μm,比重7.0g/cm3)之量設為150份以外,餘與實施例1同樣獲得接著薄膜。 In the first embodiment, an inorganic filler (having an average particle diameter of 0.5 μm and a specific gravity of 2.2 g/cm 3 , an amine decane-based coupling agent ("KBM573" manufactured by Shin-Etsu Chemical Co., Ltd.) was used to process ADOMTECH. The amount of "SO-C2" is set to 140 parts, and the magnetic filler ("AW2-08PF3F" made by EPSON ATMIX) has an average particle diameter of 3.0 μm and a specific gravity of 7.0 g/cm 3 . A film was obtained in the same manner as in Example 1 except that the amount was 150 parts.

<實施例6> <Example 6>

實施例1中,除了將無機填充材(平均粒徑0.5μm,比 重2.2g/cm3,以胺基矽烷系偶合劑(信越化學工業(股)製之「KBM573」)處理ADOMTECH(股)製之「SO-C2」而成之二氧化矽)之量設為80份,將磁性填料(EPSON ATMIX(股)製之「AW2-08PF3F」,平均粒徑3.0μm,比重7.0g/cm3)之量設為130份以外,餘與實施例1同樣獲得接著薄膜。 In the first embodiment, an inorganic filler (having an average particle diameter of 0.5 μm and a specific gravity of 2.2 g/cm 3 , an amine decane-based coupling agent ("KBM573" manufactured by Shin-Etsu Chemical Co., Ltd.) was used to process ADOMTECH. The amount of "SO-C2" is set to 80 parts, and the magnetic filler ("AW2-08PF3F" made by EPSON ATMIX) has an average particle diameter of 3.0 μm and a specific gravity of 7.0 g/cm 3 . A film was obtained in the same manner as in Example 1 except that the amount was 130 parts.

<實施例7> <Example 7>

實施例1中,除了將無機填充材(平均粒徑0.5μm,比重2.2g/cm3,以胺基矽烷系偶合劑(信越化學工業(股)製之「KBM573」)處理ADOMTECH(股)製之「SO-C2」而成之二氧化矽)之量設為35份,將磁性填料(EPSON ATMIX(股)製之「AW2-08PF3F」,平均粒徑3.0μm,比重7.0g/cm3)之量設為110份以外,餘與實施例1同樣獲得接著薄膜。 In the first embodiment, an inorganic filler (having an average particle diameter of 0.5 μm and a specific gravity of 2.2 g/cm 3 , an amine decane-based coupling agent ("KBM573" manufactured by Shin-Etsu Chemical Co., Ltd.) was used to process ADOMTECH. The amount of "SO-C2" is set to 35 parts, and the magnetic filler ("AW2-08PF3F" made by EPSON ATMIX) has an average particle diameter of 3.0 μm and a specific gravity of 7.0 g/cm 3 . The adhesive film was obtained in the same manner as in Example 1 except that the amount was changed to 110 parts.

<實施例8> <Example 8>

使液狀雙酚A型環氧樹脂(環氧當量190,比重1.2g/cm3,三菱化學(股)製之「jER828EL」)14份、聯苯型環氧樹脂(環氧當量291,比重1.2g/cm3,日本化藥(股)製之「NC3000H」)14份、苯氧樹脂(重量平均分子量38000,比重1.2g/cm3,三菱化學(股)製之「YX6954」,不揮發成分30質量%之MEK與環己酮之1:1溶液)40份邊於MEK 5份、環己酮5份中攪拌邊加熱溶解。接著, 混合酚酚醛清漆系硬化劑(DIC(股)製之「LA-7054」(含有三嗪骨架之酚系硬化劑)之不揮發成分60%之MEK溶液、酚性羥基當量124、比重1.2g/cm3)30份、硬化促進劑(四國化成工業(股)製之「2E4MZ」、比重1.1g/cm3)0.1份、無機填充材(平均粒徑0.5μm,比重2.2g/cm3,以胺基矽烷系偶合劑(信越化學工業(股)製之「KBM573」)處理ADOMTECH(股)製之「SO-C2」而成之二氧化矽)150份、磁性填料(EPSON ATMIX(股)製之「AW2-08PF3F」、Fe-Cr-Si系合金(非晶型),平均粒徑3.0μm,比重7.0g/cm3)360份,以高速旋轉混練機均勻分散,調製樹脂漆料,與實施例1同樣獲得接著薄膜。 So that a liquid bisphenol A epoxy resin (epoxy equivalent 190, specific gravity of 1.2g / cm 3, manufactured by Mitsubishi Chemical (shares) of the manufactured 'jER828EL ") 14 parts biphenyl type epoxy resin (epoxy equivalent of 291, a specific gravity 1.2 g/cm 3 , "NC3000H" manufactured by Nippon Kayaku Co., Ltd., 14 parts, phenoxy resin (weight average molecular weight 38000, specific gravity 1.2g/cm 3 , "YX6954" manufactured by Mitsubishi Chemical Corporation), non-volatile 40 parts by weight of a 1:1 solution of MEK and cyclohexanone in a component of 30% by mass, and dissolved in 5 parts of MEK and 5 parts of cyclohexanone while stirring. Next, a 60% MEK solution, a phenolic hydroxyl equivalent of 124, and a specific gravity of 1.2, which are nonvolatile components of "LA-7054" (a phenolic hardener containing a triazine skeleton) made by DIC Co., Ltd., are mixed. g/cm 3 ) 30 parts, hardening accelerator ("2E4MZ" manufactured by Shikoku Chemicals Co., Ltd., specific gravity 1.1g/cm 3 ) 0.1 parts, inorganic filler (average particle size 0.5 μm, specific gravity 2.2 g/cm) 3 , an amine-based decane-based coupling agent ("KBM573" manufactured by Shin-Etsu Chemical Co., Ltd.) is used to process 150 parts of "SO-C2" ruthenium dioxide produced by ADOMTECH Co., Ltd., and magnetic filler (EPSON ATMIX ( "AW2-08PF3F", Fe-Cr-Si alloy (amorphous), average particle size 3.0μm, specific gravity 7.0g/cm 3 ) 360 parts, uniformly dispersed by high-speed rotary kneading machine to prepare resin paint A film of the adhesive film was obtained in the same manner as in Example 1.

<實施例9> <Example 9>

實施例8中,除了將無機填充材設為平均粒徑1μm,比重2.2g/cm3,以胺基矽烷系偶合劑(信越化學工業(股)製之「KBM573」)處理ADOMTECH(股)製之「SO-C4」而成之二氧化矽)150份以外,餘與實施例8同樣獲得接著薄膜。 In the eighth embodiment, the inorganic filler was set to have an average particle diameter of 1 μm and a specific gravity of 2.2 g/cm 3 , and an amino decane-based coupling agent ("KBM573" manufactured by Shin-Etsu Chemical Co., Ltd.) was used to process ADOMTECH. A film was obtained in the same manner as in Example 8 except that 150 parts of "SO-C4" was added as the cerium oxide.

<實施例10> <Example 10>

實施例8中,除了將無機填充材設為平均粒徑2μm,比重2.2g/cm3,以胺基矽烷系偶合劑(信越化學工業(股)製之「KBM573」)處理ADOMTECH(股)製之「SO-C6」而成之二氧化矽)150份以外,餘與實施例8同樣獲得接著薄 膜。 In Example 8, except that the average particle diameter of the inorganic filler is set to 2 m, a specific gravity 2.2g / cm 3, to amine Silane coupling agent (Shin-Etsu Chemical (shares) made of "KBM573") process ADOMTECH (shares) manufactured A film was obtained in the same manner as in Example 8 except that 150 parts of "SO-C6" was added as the cerium oxide.

<比較例1> <Comparative Example 1>

實施例1中,除了未使用磁性填料(EPSON ATMIX(股)製之「AW2-08PF3F」,平均粒徑3.0μm,比重7.0g/cm3),且將無機填充材(平均粒徑0.5μm,比重2.2g/cm3,以胺基矽烷系偶合劑(信越化學工業(股)製之「KBM573」)處理ADOMTECH(股)製之「SO-C2」而成之二氧化矽)之量設為70份以外,餘與實施例1同樣獲得接著薄膜。 In Example 1, except that a magnetic filler ("AW2-08PF3F" manufactured by EPSON ATMIX Co., Ltd., an average particle diameter of 3.0 μm, a specific gravity of 7.0 g/cm 3 ) was used, and an inorganic filler (average particle diameter of 0.5 μm, The specific gravity is 2.2 g/cm 3 , and the amount of the "SO-C2" (manufactured by Shin-Etsu Chemical Co., Ltd. "KBM573") is treated with "SO-C2". A film was obtained in the same manner as in Example 1 except for 70 parts.

<比較例2> <Comparative Example 2>

實施例1中,除了將磁性填料(平均粒徑3.0μm,EPSON ATMIX(股)製之「AW2-08PF3F」,比重7.0g/cm3)之量設為700份以外,餘與實施例1同樣獲得接著薄膜。 In the first embodiment, the same amount as in the first embodiment except that the amount of the magnetic filler (average particle diameter: 3.0 μm, "AW2-08PF3F" manufactured by EPSON ATMIX Co., Ltd., specific gravity: 7.0 g/cm 3 ) was 700 parts. A follow-up film was obtained.

<比較例3> <Comparative Example 3>

實施例1中,除了未使用無機填充材,且將磁性填料(平均粒徑3.0μm,EPSON ATMIX(股)製之「AW2-08PF3F」,比重7.0g/cm3)之量設為210份以外,餘與實施例1同樣獲得接著薄膜。 In the first embodiment, the amount of the magnetic filler (average particle diameter: 3.0 μm, "AW2-08PF3F" manufactured by EPSON ATMIX, specific gravity: 7.0 g/cm 3 ) was 210 parts, except that the inorganic filler was not used. The adhesive film was obtained in the same manner as in Example 1.

<比較例4> <Comparative Example 4>

實施例1中,除了將無機填充材(平均粒徑0.5μm,比 重2.2g/cm3,以胺基矽烷系偶合劑(信越化學工業(股)製之「KBM573」)處理ADOMTECH(股)製之「SO-C2」而成之二氧化矽)之量設為600份,將磁性填料(平均粒徑3.0μm,EPSON ATMIX(股)製之「AW2-08PF3F」,比重7.0g/cm3)之量設為290份以外,餘與實施例1同樣獲得接著薄膜。 In Example 1, except that the inorganic filler (average particle diameter of 0.5 m, specific gravity of 2.2g / cm 3, to amine Silane coupling agent (Shin-Etsu Chemical (shares) made of "KBM573") process ADOMTECH (shares) manufactured The amount of "SO-C2" is set to 600 parts, and the magnetic filler (average particle diameter: 3.0 μm, "AW2-08PF3F" manufactured by EPSON ATMIX Co., Ltd., specific gravity: 7.0 g/cm 3 ) The film was obtained in the same manner as in Example 1 except that the amount was 290 parts.

實施例1~7及比較例1~4各例中該樹脂漆料之以不揮發成分量換算之組成示於下述表1。實施例8~10各例中該樹脂漆料之以不揮發成分量換算之組成示於下述表2。 The composition of the resin paint in terms of the nonvolatile content in each of Examples 1 to 7 and Comparative Examples 1 to 4 is shown in Table 1 below. The composition of the resin paint in terms of the nonvolatile content in each of Examples 8 to 10 is shown in Table 2 below.

<磁導率之測定方法> <Method for Measuring Magnetic Permeability>

實施例1~8及比較例1~4之各例中,除了使用施以氟樹脂系脫膜劑(ETFE)處理之PET薄膜(三菱樹脂(股)製之「FLUOROJU RL50KSE」)作為支撐體以外,餘同樣地,獲得具有與各實施例及各比較例相同之樹脂組成物層之接著薄膜。藉由使所得接著薄膜在180℃加熱90分鐘使樹脂組成物層熱硬化,且剝離支撐體而獲得薄片狀之硬化物。將所得硬化物切成寬5mm、長18mm之試驗片,作成評價樣品。使用Agilent Technologies公司製之 「HP8362B」(商品名),以短路條線(stripline)法,將測定頻率設為100MHz至10GHz之範圍,測定該評價樣品在室溫23℃之磁導率(μ’)及磁導損失(μ”)。測定頻率為1GHz及3GHz時之磁導率、測定頻率為1GHz及3GHz時之磁導損失示於下述表3及4。 In each of Examples 1 to 8 and Comparative Examples 1 to 4, a PET film ("FLUOROJU RL50KSE" manufactured by Mitsubishi Resin Co., Ltd.) treated with a fluororesin-based release agent (ETFE) was used as a support. In the same manner, a film having the same resin composition layer as each of the examples and the comparative examples was obtained. The resin composition layer was thermally hardened by heating the obtained adhesive film at 180 ° C for 90 minutes, and the support was peeled off to obtain a flaky cured product. The obtained cured product was cut into test pieces having a width of 5 mm and a length of 18 mm to prepare an evaluation sample. Using Agilent Technologies "HP8362B" (trade name), the measurement frequency was set to the range of 100 MHz to 10 GHz by a short-circuit strip method, and the magnetic permeability (μ') and magnetic permeability loss of the evaluation sample at room temperature of 23 ° C were measured ( μ"). The magnetic permeability at a measurement frequency of 1 GHz and 3 GHz and the magnetic permeability loss at a measurement frequency of 1 GHz and 3 GHz are shown in Tables 3 and 4 below.

<絕緣性之評價> <Evaluation of insulation>

使用名機製作所(股)製之批式真空加壓層合機「MVLP-500」(商品名),將實施例1~8及比較例1~4中獲得之接著薄膜各薄膜層合於形成有線及間隔之寬度設為L(線)/S(間隔)=15μm/15μm、電路(配線圖型)厚度為8μm之梳型配線圖型之厚度為38μm之聚醯亞胺薄膜之配線圖型側。自藉由該層合形成之接著薄膜剝離PET薄膜,進行180℃、90分鐘之加熱處理予以熱硬化而形成絕緣層。所得積層構造體作為評價用樣品。 A batch vacuum lamination machine "MVLP-500" (trade name) manufactured by Nippon Seisakusho Co., Ltd. was used, and the respective films obtained in Examples 1 to 8 and Comparative Examples 1 to 4 were laminated to form a film. The wiring pattern of the polyimide film with a thickness of 38 μm and a thickness of 8 μm in the width of the wire and the interval is set to L (line) / S (interval) = 15 μm / 15 μm, and the circuit (wiring pattern) is 8 μm thick. side. The PET film was peeled off from the film formed by the lamination, and heat-hardened at 180 ° C for 90 minutes to form an insulating layer. The obtained laminated structure was used as a sample for evaluation.

首先對所得評價用樣品施加3.3V之電壓,測定初期電阻值。進而對評價用樣品施加3.3V之電壓一面放置於130℃、相對濕度85%之條件之環境中100小時。放置100小時後(HAST100小時後)未觀察到絕緣電阻值降低且樣品能使用。算出試驗片能使用率。又試驗片能使用率之計算時,放置100小時後絕緣層之絕緣電阻值超過1.0×106Ω時評價為「能使用」,放置100小時後絕緣層之絕緣電阻值為1.0×106Ω以下時評價為「不能使用」。結果示於下述表3及4。又比較例4中該接著薄膜由於成形性 有問題故無法試驗試驗片能使用率,關於比較例4之試驗初期電阻值亦無法試驗。 First, a voltage of 3.3 V was applied to the obtained sample for evaluation, and the initial resistance value was measured. Further, while applying a voltage of 3.3 V to the sample for evaluation, it was placed in an environment of 130 ° C and a relative humidity of 85% for 100 hours. After standing for 100 hours (after HAST 100 hours), no decrease in the insulation resistance value was observed and the sample was usable. Calculate the test piece usability. When the test piece can be used, the insulation resistance of the insulating layer exceeds 1.0 × 10 6 Ω after being placed for 100 hours, and it is evaluated as "usable". After 100 hours, the insulation resistance of the insulating layer is 1.0 × 10 6 Ω. The evaluation below is "cannot be used". The results are shown in Tables 3 and 4 below. Further, in Comparative Example 4, the adhesive film could not be tested for the useability of the test piece due to a problem in moldability, and the initial resistance value of the test of Comparative Example 4 could not be tested.

<層合性之評價> <Evaluation of lamination property>

使用名機製作所(股)製之批式真空加壓層合機「MVLP-500」(商品名),將實施例1~8及比較例1~4所得之接著薄膜各層合於配線板之兩面。層合係在將減壓之氣壓設為13hPa以下壓著30秒,隨後在100℃將按壓力設為0.74MPa壓著30秒而進行。評價係根據下述評價基準,藉由檢查所得積層構造體外觀進行。結果示於下述表3及表4。 A batch vacuum lamination machine "MVLP-500" (trade name) manufactured by Nihon Seiki Co., Ltd. was used, and the adhesive films obtained in Examples 1 to 8 and Comparative Examples 1 to 4 were laminated on both sides of the wiring board. . The laminating system was pressed at a pressure of 13 hPa or less for 30 seconds, and then pressed at a pressure of 0.74 MPa at 100 ° C for 30 seconds. The evaluation was carried out by examining the appearance of the obtained laminated structure based on the following evaluation criteria. The results are shown in Tables 3 and 4 below.

評價基準 Evaluation basis

○:配線板之電路部分無孔洞,源自接著薄膜之樹脂組成物充分流動。 ○: The circuit portion of the wiring board has no holes, and the resin composition from the film is sufficiently flowed.

×:配線板之電路部分發生孔洞,源自接著薄膜之樹脂組成物在層合時之流動性不足。 X: Holes were formed in the circuit portion of the wiring board, and the flow of the resin composition derived from the film after lamination was insufficient.

可知本發明實施例中,具有該前述組成之樹脂組成物在形成絕緣層時之流動性優異,作成絕緣層(硬化物)時之配線層之密封性優異。且可知,使用具備含有該樹脂組成物之樹脂組成物層之接著薄膜所形成之絕緣層在頻率為1GHz以上之高頻帶區域(千兆赫帶),尤其是1GHz至3GHz之範圍之磁導率提高,且抑制磁性損失。進而由試驗片能使用率之結果可了解,由具有前述組成之樹脂組成物形成之絕緣層之絕緣性之信賴性優異。因此,若使用本發明之接著薄膜,可藉簡易步驟提供擠入更高性能之高頻帶區域用電感器元件之配線板。 In the examples of the present invention, the resin composition having the above-described composition is excellent in fluidity when the insulating layer is formed, and is excellent in the sealing property of the wiring layer when the insulating layer (cured material) is formed. It is also known that the insulating layer formed using the adhesive film having the resin composition layer containing the resin composition has a magnetic permeability in a high frequency band region (gigahertz band) having a frequency of 1 GHz or more, particularly in the range of 1 GHz to 3 GHz. And inhibit magnetic loss. Further, as a result of the use rate of the test piece, it is understood that the insulating layer formed of the resin composition having the above composition is excellent in insulation reliability. Therefore, if the adhesive film of the present invention is used, a wiring board for squeezing a higher performance high-frequency band inductor element can be provided in a simple step.

20‧‧‧芯基材(內層電路基板) 20‧‧‧ core substrate (inner circuit board)

20a‧‧‧第1主表面 20a‧‧‧1st main surface

20b‧‧‧第2主表面 20b‧‧‧2nd main surface

22‧‧‧貫穿孔 22‧‧‧through holes

22a‧‧‧貫穿孔內配線 22a‧‧‧Wiring in the through hole

24‧‧‧外部端子 24‧‧‧External terminals

30‧‧‧絕緣部 30‧‧‧Insulation

32‧‧‧第1絕緣層 32‧‧‧1st insulation layer

34‧‧‧第2絕緣層 34‧‧‧2nd insulation layer

36‧‧‧通孔 36‧‧‧through hole

36a‧‧‧通孔內配線 36a‧‧‧Through wiring

40‧‧‧線圈狀導電性構造體 40‧‧‧Circular conductive structure

42‧‧‧第1配線層 42‧‧‧1st wiring layer

42a‧‧‧焊墊 42a‧‧‧ solder pads

44‧‧‧第2配線層 44‧‧‧2nd wiring layer

Claims (20)

種接著薄膜,其係具有支撐體與設於該支撐體上之樹脂組成物層之接著薄膜,其中前述樹脂組成物層含有成分(A)熱硬化性樹脂、成分(B)磁性填料、及成分(C)無機填充材,且將構成前述樹脂組成物層之樹脂組成物中之不揮發成分設為100體積%時,成分(B)之含量為10體積%以上,且成分(C)之含量除以成分(B)之含量之值為0.3~3.0之範圍。 The adhesive film is a film having a support and a resin composition layer provided on the support, wherein the resin composition layer contains a component (A) a thermosetting resin, a component (B) a magnetic filler, and a component. (C) Inorganic filler, when the nonvolatile content in the resin composition constituting the resin composition layer is 100% by volume, the content of the component (B) is 10% by volume or more, and the content of the component (C) Divided by the content of the component (B), the value is in the range of 0.3 to 3.0. 如請求項1之接著薄膜,其中成分(A)為環氧樹脂,前述樹脂組成物進而含有選自酚系硬化劑及萘酚系硬化劑之環氧樹脂硬化劑。 The film according to claim 1, wherein the component (A) is an epoxy resin, and the resin composition further contains an epoxy resin hardener selected from the group consisting of a phenolic curing agent and a naphthol curing agent. 如請求項2之接著薄膜,其中環氧樹脂硬化劑係選自含三嗪骨架之甲酚系硬化劑及含三嗪骨架之酚系硬化劑。 The adhesive film according to claim 2, wherein the epoxy resin hardener is selected from the group consisting of a cresy-based hardener containing a triazine skeleton and a phenolic hardener containing a triazine skeleton. 如請求項1之接著薄膜,其中前述樹脂組成物進而含有熱可塑性樹脂。 The film according to claim 1, wherein the resin composition further contains a thermoplastic resin. 如請求項1之接著薄膜,其中前述樹脂組成物中,成分(B)之含量為10體積%~40體積%,且成分(C)之含量為10體積%~50體積%。 The film according to claim 1, wherein the content of the component (B) in the resin composition is from 10% by volume to 40% by volume, and the content of the component (C) is from 10% by volume to 50% by volume. 如請求項1之接著薄膜,其中前述樹脂組成物中,成分(B)與成分(C)之含量合計為20體積%~75體積%。 The film according to claim 1, wherein the content of the component (B) and the component (C) in the resin composition is 20% by volume to 75% by volume in total. 如請求項1之接著薄膜,其中前述樹脂組成物 中,成分(B)之含量為10體積%~25體積%。 An adhesive film according to claim 1, wherein the foregoing resin composition The content of the component (B) is from 10% by volume to 25% by volume. 如請求項1之接著薄膜,其中前述樹脂組成物中,成分(B)之含量為20體積%~25體積%,成分(C)之含量為10體積%~25體積%,且成分(B)與成分(C)之含量合計為30體積%~50體積%。 The film according to claim 1, wherein the content of the component (B) in the resin composition is 20% by volume to 25% by volume, and the content of the component (C) is 10% by volume to 25% by volume, and the component (B) The total content of the component (C) is from 30% by volume to 50% by volume. 如請求項1之接著薄膜,其中前述樹脂組成物中,成分(B)之平均粒徑為0.3μm~10μm。 The film according to claim 1, wherein the component (B) has an average particle diameter of 0.3 μm to 10 μm in the resin composition. 如請求項1之接著薄膜,其中成分(C)之平均粒徑為0.01μm~5μm。 The film according to claim 1, wherein the component (C) has an average particle diameter of from 0.01 μm to 5 μm. 如請求項1之接著薄膜,其中成分(B)之平均粒徑大於成分(C)之平均粒徑。 The film according to claim 1, wherein the average particle diameter of the component (B) is larger than the average particle diameter of the component (C). 如請求項1之接著薄膜,其中成分(C)為二氧化矽。 An adhesive film according to claim 1, wherein component (C) is cerium oxide. 如請求項1之接著薄膜,其中成分(C)係經表面處理劑處理之二氧化矽。 The film according to claim 1, wherein the component (C) is a cerium oxide treated with a surface treating agent. 如請求項13之接著薄膜,其中表面處理劑為胺基矽烷系偶合劑。 An adhesive film according to claim 13, wherein the surface treating agent is an amino decane-based coupling agent. 如請求項1之接著薄膜,其中作成硬化物時,於頻率為1GHz至3GHz時之磁導率為1.1以上,且於頻率為1GHz至3GHz時之磁性損失為0.5以下。 The film according to claim 1, wherein when the cured product is formed, the magnetic permeability at a frequency of 1 GHz to 3 GHz is 1.1 or more, and the magnetic loss at a frequency of 1 GHz to 3 GHz is 0.5 or less. 如請求項1之接著薄膜,其中作成硬化物時,於頻率為1GHz至3GHz時之磁導率為1.2以上,且於頻率為1GHz至3GHz時之磁性損失為0.3以下。 The film according to claim 1, wherein when the cured product is formed, the magnetic permeability at a frequency of 1 GHz to 3 GHz is 1.2 or more, and the magnetic loss at a frequency of 1 GHz to 3 GHz is 0.3 or less. 如請求項1之接著薄膜,其係用於形成具備電感 器元件之配線板的絕緣層。 Such as the film of claim 1, which is used to form an inductor The insulating layer of the wiring board of the device. 一種配線板,其具有如請求項1~16中任一項之接著薄膜之樹脂組成物層的硬化物之絕緣層,與至少一部分埋入該絕緣層中之線圈狀導電性構造體,且包含電感器元件,其係由前述線圈狀導電性構造體與於前述絕緣層之厚度方向延伸且由前述線圈狀導電性構造體所包圍之前述絕緣層中之一部分所構成。 A wiring board having an insulating layer of a cured material of a resin composition layer of a film according to any one of claims 1 to 16, and a coil-shaped conductive structure in which at least a part of the insulating layer is embedded, and comprising The inductor element is composed of one of the coil-shaped conductive structures and the insulating layer extending in the thickness direction of the insulating layer and surrounded by the coil-shaped conductive structure. 如請求項18之配線板,其中前述電感器元件發揮功能之頻率為1GHz以上。 The wiring board of claim 18, wherein the frequency at which the inductor element functions is 1 GHz or more. 一種配線板之製造方法,該配線板係具有含有第1絕緣層及第2絕緣層之絕緣部、與至少一部分埋入該絕緣部中之線圈狀導電性構造體,且包含由該線圈狀導電性構造體與前述絕緣部中之一部分構成之電感器元件,該製造方法包含下列步驟:準備如請求項1~16中任一項之接著薄膜、及設有第1配線層之芯基材之步驟,將前述接著薄膜之樹脂組成物層層合於前述芯基材上之步驟,使前述樹脂組成物層熱硬化而形成第1絕緣層之步驟,於前述第1絕緣層上形成通孔之步驟,對形成有前述通孔之前述第1絕緣層進行粗化處理之步驟,於前述第1絕緣層上形成第2配線層,且形成使前述 第1配線層與前述第2配線層電性連接之通孔內配線之步驟,進而將前述接著薄膜層合於形成有前述第2配線層及前述通孔內配線之前述第1絕緣層上,並經熱硬化而形成前述第2絕緣層之步驟,形成包含含有前述第1配線層之一部分與前述第2配線層之一部分與前述通孔內配線之線圈狀導電性構造體、及朝前述絕緣部之厚度方向延伸且由前述線圈狀導電性構造體包圍之前述絕緣部之一部分之前述電感器元件之步驟。 A method of manufacturing a wiring board comprising: an insulating portion including a first insulating layer and a second insulating layer; and a coil-shaped conductive structure in which at least a portion is embedded in the insulating portion, and including the coil-shaped conductive body An inductor element comprising a structural part and a part of the insulating portion, the manufacturing method comprising the steps of: preparing a bonding film according to any one of claims 1 to 16, and a core substrate provided with the first wiring layer a step of laminating the resin composition layer of the adhesive film on the core substrate, thermally curing the resin composition layer to form a first insulating layer, and forming a through hole in the first insulating layer a step of roughening the first insulating layer on which the via hole is formed, forming a second wiring layer on the first insulating layer, and forming the a step of wiring the through hole in the first wiring layer and the second wiring layer, and further bonding the bonding film to the first insulating layer on which the second wiring layer and the via wiring are formed. a step of forming the second insulating layer by thermosetting, and forming a coil-shaped conductive structure including a portion of the first wiring layer and a portion of the second wiring layer and the wiring in the via hole, and insulating the insulating layer a step of extending the thickness direction of the inductor element in a portion of the insulating portion surrounded by the coil-shaped conductive structure.
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