TW201602610A - System and method for measuring magnetic properties - Google Patents

System and method for measuring magnetic properties Download PDF

Info

Publication number
TW201602610A
TW201602610A TW103123606A TW103123606A TW201602610A TW 201602610 A TW201602610 A TW 201602610A TW 103123606 A TW103123606 A TW 103123606A TW 103123606 A TW103123606 A TW 103123606A TW 201602610 A TW201602610 A TW 201602610A
Authority
TW
Taiwan
Prior art keywords
magnetic
tested
excitation
metal piece
core
Prior art date
Application number
TW103123606A
Other languages
Chinese (zh)
Other versions
TWI515446B (en
Inventor
郭士綱
李文傑
林省揚
Original Assignee
中國鋼鐵股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 中國鋼鐵股份有限公司 filed Critical 中國鋼鐵股份有限公司
Priority to TW103123606A priority Critical patent/TWI515446B/en
Application granted granted Critical
Publication of TWI515446B publication Critical patent/TWI515446B/en
Publication of TW201602610A publication Critical patent/TW201602610A/en

Links

Landscapes

  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)

Abstract

A system and a method for measuring magnetic properties are provided. The system includes an excitation device, a magnetic field measure device and a magnetic flux measure device, in which the excitation device includes a first excitation core and a second excitation core. In the method for measuring magnetic properties, at first, the first excitation core and the second excitation core are used to clip a metal plate to be measured. The first excitation core and the second excitation core are symmetrically disposed on two opposite surfaces of the measured metal plate to clip the measured metal plate. Thereafter, the magnetic field measure device is used to measure the magnetic field provided by the excitation device. Then, the magnetic flux measure device is used to measure the magnetic flux of the metal plate.

Description

磁性量測系統以及磁性量測方法 Magnetic measuring system and magnetic measuring method

本發明是有關於一種磁性量測系統以及磁性量測方法,特別是有關於電磁鋼片之磁性量測系統以及磁性量測方法。 The invention relates to a magnetic measuring system and a magnetic measuring method, in particular to a magnetic measuring system for electromagnetic steel sheets and a magnetic measuring method.

近年來,為了符合節約能源的發展趨勢,電機產品朝向高效率與小型化發展。在電機特性方面,電機產品則有朝著變頻與高頻化發展的趨勢。為了滿足電機產品各種性能的要求,關鍵鐵芯材料的選擇顯得格外重要。一般而言,電機產品的鐵芯材料係以電磁鋼片製成。為了使電機產品(例如:高效率馬達、變頻馬達、電動車驅動馬達、伺服馬達、高速主軸馬達以及高效率變壓器)滿足所需之性能要求,電機產品所採用之電磁鋼片的磁性特性需要符合電機產品之規範。目前測量電磁鋼片磁性的設備包含愛普斯坦磁性測量器(Epstein tester)、單片磁性量測設備(Single sheet tester;SST)。 In recent years, in order to meet the trend of energy conservation, motor products have developed toward high efficiency and miniaturization. In terms of motor characteristics, motor products have a tendency to develop toward frequency conversion and high frequency. In order to meet the various performance requirements of motor products, the selection of key core materials is particularly important. In general, the core material of the motor product is made of electromagnetic steel sheets. In order to meet the required performance requirements of motor products (eg high-efficiency motors, variable frequency motors, electric drive motors, servo motors, high-speed spindle motors, and high-efficiency transformers), the magnetic properties of the electromagnetic steel sheets used in motor products need to be met. Specification of motor products. The current equipment for measuring the magnetic properties of electromagnetic steel sheets includes an Epstein tester and a single sheet tester (SST).

愛普斯坦磁性測量器需要將電磁鋼片取樣成長條型的試片,並堆疊成封閉的磁迴路,再於磁迴路上放置激磁裝置與感應線圈來測得疊片整體的磁特性,如磁滯曲線、鐵損等。然而,愛普斯坦磁性測量器需要相當多的取 樣數目,耗費大量的時間與成本。因此,業界開發出了單片磁性量測設備來克服這些問題。 The Epstein magnetic measuring device needs to sample the electromagnetic steel sheets into strips of test strips and stack them into a closed magnetic circuit, and then place the excitation device and the induction coil on the magnetic circuit to measure the overall magnetic properties of the laminated sheets, such as magnetic Hysteresis curve, iron loss, etc. However, Epstein magnetic gauges require quite a bit of take The number of samples takes a lot of time and cost. Therefore, the industry has developed a single piece of magnetic measurement equipment to overcome these problems.

單片磁性量測設備係採用C型鐵芯與試片形成封閉迴路,激磁裝置與感應線圈環繞於試片。然而,單片磁性量測設備之線圈內可允許放置的試片最大寬度為60mm。對於使用者而言,剪切電磁鋼片來符合試片的尺寸要求非常不方便,因為剪切的過程也會影響電磁鋼片的特性。為此,又發展出了探頭式鐵損量測設備(DAC-IR-3,由Soken公司製造)。 The single-piece magnetic measuring device adopts a C-shaped iron core and a test piece to form a closed loop, and the excitation device and the induction coil surround the test piece. However, the maximum width of the test piece that can be placed in the coil of the single-piece magnetic measuring device is 60 mm. For the user, it is very inconvenient to cut the electromagnetic steel sheet to meet the size requirements of the test piece, because the shearing process also affects the characteristics of the electromagnetic steel sheet. To this end, a probe type iron loss measuring device (DAC-IR-3, manufactured by Soken Corporation) has been developed.

探頭式鐵損量測設備只需將探頭設置於試片上,即可測出鐵損。然而,這種方式有幾以下幾種缺點:(1)在接近磁飽和狀態時,磁通密度的量測會受到鐵芯材質的影響;(2)單激磁迴路設計,且試片大小必須與探頭相配合,不同大小的試片需要不同的探頭。 The probe type iron loss measuring device can measure the iron loss by simply placing the probe on the test piece. However, there are several disadvantages in this way: (1) When approaching the magnetic saturation state, the measurement of the magnetic flux density is affected by the core material; (2) the design of the single excitation circuit, and the size of the test piece must be The probes are matched, and different sizes of test strips require different probes.

有鑑於此,需要一種新的磁性量測系統以及磁性量測方法來解決上述問題。 In view of this, a new magnetic measuring system and a magnetic measuring method are needed to solve the above problems.

本發明之一方面是在提供一種磁性量測系統以及磁性量測方法,其具有雙激磁迴路設計,且試片大小的限制也較習知技術少。 One aspect of the present invention is to provide a magnetic measurement system and a magnetic measurement method having a dual excitation circuit design, and the size of the test piece is also less limited than conventional techniques.

根據本發明之一實施例,此磁性量測系統包含激磁裝置、磁場強度測量裝置以及磁通密度測量裝置。激磁裝置包含第一激磁鐵芯和第二激磁鐵芯。第一激磁鐵芯和第二激磁鐵芯為C形鐵芯,且對稱地設置於待測金屬片之兩 相對表面上,以夾持待測金屬片。磁場強度測量裝置係用以量測該激磁裝置所提供之磁場強度。磁通密度測量裝置係用以量測該待測金屬片之磁通密度。 According to an embodiment of the invention, the magnetic measurement system comprises an excitation device, a magnetic field strength measuring device, and a magnetic flux density measuring device. The excitation device includes a first excitation core and a second excitation core. The first exciting core and the second exciting core are C-shaped cores, and are symmetrically disposed on the two metal sheets to be tested On the opposite surface, to hold the metal piece to be tested. The magnetic field strength measuring device is used to measure the strength of the magnetic field provided by the exciting device. The magnetic flux density measuring device is used to measure the magnetic flux density of the metal piece to be tested.

根據本發明之一實施例,在此磁性量測方法中,首先提供激磁裝置,其中此激磁裝置包含第一激磁鐵芯和第二激磁鐵芯。然後,利用第一激磁鐵芯和第二激磁鐵芯來夾持待測金屬片。接著,利用磁場強度測量裝置來量測激磁裝置所提供之磁場強度。然後,利用磁通密度測量裝置來量測待測金屬片之磁通密度。 According to an embodiment of the present invention, in the magnetic measurement method, an excitation device is first provided, wherein the excitation device includes a first excitation core and a second excitation core. Then, the first magnet core and the second core are used to hold the metal piece to be tested. Next, the magnetic field strength measuring device is used to measure the magnetic field strength provided by the excitation device. Then, a magnetic flux density measuring device is used to measure the magnetic flux density of the metal piece to be tested.

為讓本發明之上述和其他目的、特徵、和優點能更明顯易懂,上文特舉數個較佳實施例,並配合所附圖式,作詳細說明如下: 第1圖係繪示根據本發明實施例之磁性量測系統的架構示意圖。 The above and other objects, features, and advantages of the present invention will become more apparent and understood. 1 is a schematic view showing the structure of a magnetic measuring system according to an embodiment of the present invention.

第2圖係繪示根據本發明實施例之磁性量測方法的流程示意圖。 2 is a flow chart showing a magnetic measurement method according to an embodiment of the present invention.

第3圖係繪示根據本發明實施例之激磁裝置所提供之激磁迴路示意圖。 Figure 3 is a schematic view showing the excitation circuit provided by the excitation device according to an embodiment of the present invention.

請參照第1圖,其係繪示根據本發明實施例之磁性量測系統100的架構示意圖。磁性量測系統100包含激磁裝置110、磁場強度測量裝置120以及磁通密度測量裝置130。激磁裝置110包含第一激磁鐵芯112和第二激磁鐵芯114。第一激磁鐵芯112和第二激磁鐵芯114係挾持待測金 屬片M(例如電磁鋼片),並提供磁場。在本實施例中,第一激磁鐵芯112和第二激磁鐵芯114上繞設有激磁線圈(未繪示),且第一激磁鐵芯112和第二激磁鐵芯114為C形鐵芯,但本發明之實施例並不受限於此。 Please refer to FIG. 1 , which is a schematic diagram showing the architecture of a magnetic measurement system 100 according to an embodiment of the invention. The magnetic measurement system 100 includes an excitation device 110, a magnetic field strength measurement device 120, and a magnetic flux density measurement device 130. The excitation device 110 includes a first excitation core 112 and a second excitation core 114. The first exciting core 112 and the second exciting core 114 hold the gold to be tested A piece M (such as an electromagnetic steel sheet) and a magnetic field. In this embodiment, the first exciting core 112 and the second exciting core 114 are wound around an exciting coil (not shown), and the first exciting core 112 and the second exciting core 114 are C-shaped cores. However, embodiments of the invention are not limited thereto.

磁場強度測量裝置120係量測激磁裝置110所提供之磁場強度,而磁通密度測量裝置130則用以量測待測金屬片M之磁通密度。如此,可得到磁場強度和磁通密度,並進而得到磁滯曲線以及鐵損等相關的磁特性。在本實施例中,磁場強度測量裝置120為異向磁阻(Anisotropic magnetoresistance)磁感應器或霍爾(Hall)磁感應器,而磁通密度測量裝置130為探針式(needle probe)磁通密度測量裝置。 The magnetic field strength measuring device 120 measures the magnetic field strength provided by the excitation device 110, and the magnetic flux density measuring device 130 measures the magnetic flux density of the metal piece M to be tested. In this way, the magnetic field strength and the magnetic flux density can be obtained, and magnetic hysteresis curves and magnetic properties related to iron loss and the like can be obtained. In the present embodiment, the magnetic field strength measuring device 120 is an anisotropic magnetoresistance magnetic sensor or a Hall magnetic sensor, and the magnetic flux density measuring device 130 is a probe probe magnetic flux density measurement. Device.

請參照第2圖,其係繪示根據本發明實施例之磁性量測方法200的流程示意圖。在磁性量測方法200中,首先進行步驟210,以提供激磁裝置110。然後,進行步驟220,以利用第一激磁鐵芯112和第二激磁鐵芯114來夾持待測金屬片M。如第1圖所示,第一激磁鐵芯112和第二激磁鐵芯114係對稱地設置於待測金屬片M之兩相對表面MS1和MS2上,且第一激磁鐵芯112之凹部係朝向表面MS1,而第二激磁鐵芯114之凹部係朝向表面MS2。如此,第一激磁鐵芯112和第二激磁鐵芯114之凹部係彼此相對,並提供兩條激磁迴路。 Please refer to FIG. 2 , which is a schematic flow chart of a magnetic measurement method 200 according to an embodiment of the invention. In the magnetic metrology method 200, step 210 is first performed to provide the excitation device 110. Then, step 220 is performed to sandwich the metal piece M to be tested by the first exciting core 112 and the second exciting core 114. As shown in FIG. 1, the first exciting core 112 and the second exciting core 114 are symmetrically disposed on the opposite surfaces MS1 and MS2 of the metal piece M to be tested, and the concave portion of the first exciting core 112 is oriented. The surface MS1, and the recess of the second exciting core 114 faces the surface MS2. Thus, the recesses of the first and second exciting cores 112 and 114 are opposed to each other and provide two exciting circuits.

接著,進行步驟230,以設置磁場強度測量裝置120於待測金屬片M之表面MS1上,並量測激磁裝置110所提 供之磁場強度。在本實施例中,磁場強度測量裝置120為異向磁阻磁感應器,其係設置於第一激磁鐵芯112之下方。然而,磁場強度測量裝置120之設置位置並不受限於此。磁場強度測量裝置120的設置位置儘量接近待測金屬片M即可。例如,磁場強度測量裝置120也可設置在待測金屬片M之表面MS2上。 Next, step 230 is performed to set the magnetic field strength measuring device 120 on the surface MS1 of the metal sheet M to be tested, and measure the excitation device 110 The strength of the magnetic field. In the present embodiment, the magnetic field strength measuring device 120 is an anisotropic magnetic resistance magnetic sensor disposed under the first exciting magnet core 112. However, the position at which the magnetic field strength measuring device 120 is disposed is not limited thereto. The setting position of the magnetic field strength measuring device 120 is as close as possible to the metal piece M to be tested. For example, the magnetic field strength measuring device 120 may also be disposed on the surface MS2 of the metal piece M to be tested.

接著,進行步驟240,以利用磁通密度測量裝置來量測待測金屬片M之磁通密度。在本實施例中,磁通密度測量裝置130為探針式磁通密度測量裝置,其探針係設置於磁場強度測量裝置120之兩側,以測量待測金屬片M之磁通密度。 Next, step 240 is performed to measure the magnetic flux density of the metal piece M to be tested by using the magnetic flux density measuring device. In the present embodiment, the magnetic flux density measuring device 130 is a probe type magnetic flux density measuring device, and probes are disposed on both sides of the magnetic field strength measuring device 120 to measure the magnetic flux density of the metal piece M to be tested.

請參照第3圖,其係繪示根據本發明實施例之激磁裝置110所提供之激磁迴路示意圖。激磁裝置110之第一激磁鐵芯112和第二激磁鐵芯114係提供兩條激磁迴路EC1和EC2。激磁迴路EC1和EC2係於待測金屬片M上交會,以於待測金屬片M之表面MS1和MS2上提供更均勻以及更具有對稱性的磁通量。如此,當磁場強度測量裝置120和磁通密度測量裝置130在測量磁場強度和磁通密度時,便能避免由單激磁迴路所造成的誤差。例如,在單激磁迴路的狀況下量測磁性時,測得的數據可能會隨著待測金屬片的尺寸而變化。為了避免此問題,發明實施例之激磁裝置110提供互相對稱的兩條激磁迴路EC1和EC2,如此可避免測得的磁性數據隨著待測金屬片的尺寸而變化。 Please refer to FIG. 3, which is a schematic diagram of the excitation circuit provided by the excitation device 110 according to an embodiment of the invention. The first exciting core 112 and the second exciting core 114 of the exciting device 110 provide two exciting circuits EC1 and EC2. The excitation circuits EC1 and EC2 intersect on the metal sheet M to be tested to provide a more uniform and more symmetrical magnetic flux on the surfaces MS1 and MS2 of the metal sheet M to be tested. Thus, when the magnetic field strength measuring device 120 and the magnetic flux density measuring device 130 measure the magnetic field strength and the magnetic flux density, the error caused by the single exciting circuit can be avoided. For example, when measuring magnetism in the condition of a single excitation circuit, the measured data may vary depending on the size of the metal piece to be tested. In order to avoid this problem, the excitation device 110 of the embodiment of the invention provides two excitation circuits EC1 and EC2 which are symmetrical to each other, so that the measured magnetic data can be prevented from varying with the size of the metal piece to be tested.

另外,值得一提的是,本發明實施例之待測金屬片 M只需要具有足夠的寬度來供第一激磁鐵芯112和第二激磁鐵芯114挾持即可。意即,本發明實施例之待測金屬片M只有最小寬度的限制。只要待測金屬片M之寬度大於此最小寬度,便可應用本發明實施例之磁性量測系統100以及磁性量測方法200來量測磁性。 In addition, it is worth mentioning that the metal piece to be tested according to the embodiment of the present invention M only needs to have a sufficient width for the first exciting core 112 and the second exciting core 114 to be held. That is, the metal piece M to be tested according to the embodiment of the present invention has only a limitation of the minimum width. As long as the width of the metal piece M to be tested is larger than the minimum width, the magnetic measurement system 100 and the magnetic measurement method 200 of the embodiment of the present invention can be applied to measure the magnetic properties.

由上述說明可知,本發明實施例之磁性量測系統100以及磁性量測方法200係利用第一激磁鐵芯112和第二激磁鐵芯114來提供兩條激磁迴路,以避免由單激磁迴路所造成的誤差。另外,本發明實施例之磁性量測系統100以及磁性量測方法200僅要求待測金屬片M之最小寬度,故本發明實施例之磁性量測系統100不需要經常隨著待測金屬片M的尺寸來改變第一激磁鐵芯112和第二激磁鐵芯114的大小。本發明實施例之磁性量測系統100以及磁性量測方法200可克服習知技術需經常更換探頭的缺點。 As can be seen from the above description, the magnetic measurement system 100 and the magnetic measurement method 200 of the embodiment of the present invention provide the two excitation circuits by using the first excitation core 112 and the second excitation core 114 to avoid the single excitation circuit. The error caused. In addition, the magnetic measurement system 100 and the magnetic measurement method 200 of the embodiment of the present invention only require the minimum width of the metal piece M to be tested. Therefore, the magnetic measurement system 100 of the embodiment of the present invention does not need to frequently follow the metal piece M to be tested. The size is changed to change the size of the first and second exciting cores 112, 114. The magnetic measurement system 100 and the magnetic measurement method 200 of the embodiments of the present invention can overcome the disadvantages of the prior art that the probe needs to be replaced frequently.

雖然本發明已以數個實施例揭露如上,然其並非用以限定本發明,在本發明所屬技術領域中任何具有通常知識者,在不脫離本發明之精神和範圍內,當可作各種之更動與潤飾,因此本發明之保護範圍當視後附之申請專利範圍所界定者為準。 While the invention has been described above in terms of several embodiments, it is not intended to limit the scope of the invention, and the invention may be practiced in various embodiments without departing from the spirit and scope of the invention. The scope of protection of the present invention is defined by the scope of the appended claims.

100‧‧‧磁性量測系統 100‧‧‧Magnetic measurement system

110‧‧‧激磁裝置 110‧‧‧Magnetic device

112‧‧‧第一激磁鐵芯 112‧‧‧First magnetic core

114‧‧‧第二激磁鐵芯 114‧‧‧Second magnetic core

120‧‧‧磁場強度測量裝置 120‧‧‧Magnetic field strength measuring device

130‧‧‧磁通密度測量裝置 130‧‧‧Magnetic density measuring device

200‧‧‧磁性量測方法 200‧‧‧Magnetic measurement method

210、220、230、240‧‧‧步驟 210, 220, 230, 240 ‧ ‧ steps

M‧‧‧待測金屬片 M‧‧‧metal piece to be tested

MS1、MS2‧‧‧表面 MS1, MS2‧‧‧ surface

EC1、EC2‧‧‧激磁迴路 EC1, EC2‧‧‧ excitation circuit

100‧‧‧磁性量測系統 100‧‧‧Magnetic measurement system

110‧‧‧激磁裝置 110‧‧‧Magnetic device

112‧‧‧第一激磁鐵芯 112‧‧‧First magnetic core

114‧‧‧第二激磁鐵芯 114‧‧‧Second magnetic core

120‧‧‧磁場強度測量裝置 120‧‧‧Magnetic field strength measuring device

130‧‧‧磁通密度測量裝置 130‧‧‧Magnetic density measuring device

M‧‧‧待測金屬片 M‧‧‧metal piece to be tested

MS1、MS2‧‧‧表面 MS1, MS2‧‧‧ surface

Claims (10)

一種磁性量測系統,用以量測一待測金屬片之磁性特性,其中該磁性量測系統包含:一激磁裝置,用以挾持該待測金屬片,其中該激磁裝置包含一第一激磁鐵芯和一第二激磁鐵芯,以夾持該待測金屬片;一磁場強度測量裝置,用以量測該激磁裝置所提供之磁場強度;以及一磁通密度測量裝置,用以量測該待測金屬片之磁通密度。 A magnetic measurement system for measuring the magnetic properties of a metal piece to be tested, wherein the magnetic measurement system comprises: an excitation device for holding the metal piece to be tested, wherein the excitation device comprises a first excitation magnet a core and a second exciting core for clamping the metal piece to be tested; a magnetic field strength measuring device for measuring the magnetic field strength provided by the excitation device; and a magnetic flux density measuring device for measuring the magnetic field The magnetic flux density of the metal piece to be tested. 如請求項第1項所述之磁性量測系統,其中該第一激磁鐵芯和該第二激磁鐵芯為C形鐵芯,且對稱地設置於該待測金屬片之一第一表面和一第二表面上,該待測金屬片之該第一表面係相對於該待測金屬片之該第二表面。 The magnetic measurement system of claim 1, wherein the first excitation core and the second excitation core are C-shaped cores, and are symmetrically disposed on a first surface of the metal piece to be tested and On a second surface, the first surface of the metal piece to be tested is relative to the second surface of the metal piece to be tested. 如請求項第2項所述之磁性量測系統,其中該第一激磁鐵芯之凹部係朝向該待測金屬片之該第一表面,該第二激磁鐵芯之凹部係朝向該待測金屬片之該第二表面。 The magnetic measuring system of claim 2, wherein the concave portion of the first exciting magnet core faces the first surface of the metal piece to be tested, and the concave portion of the second exciting magnetic core faces the metal to be tested The second surface of the sheet. 如請求項第1項所述之磁性量測系統,其中該磁通密度測量裝置為探針式磁通密度測量裝置。 The magnetic measuring system according to claim 1, wherein the magnetic flux density measuring device is a probe type magnetic flux density measuring device. 如請求項第1項所述之磁性量測系統,其中該磁場強度測量裝置為一異向磁阻(Anisotropic magnetoresistance)磁 感應器或一霍爾(Hall)磁感應器,設置於該待測金屬片上。 The magnetic measuring system according to claim 1, wherein the magnetic field strength measuring device is an anisotropic magnetoresistance magnetic A sensor or a Hall magnetic sensor is disposed on the metal piece to be tested. 一種磁性量測方法,用以量測一待測金屬片之磁性特性,其中該磁性量測方法包含:提供一激磁裝置,其中該激磁裝置包含一第一激磁鐵芯和一第二激磁鐵芯;利用該第一激磁鐵芯和該第二激磁鐵芯來夾持該待測金屬片;利用一磁場強度測量裝置來量測該激磁裝置所提供之磁場強度;以及利用一磁通密度測量裝置來量測該待測金屬片之磁通密度。 A magnetic measurement method for measuring a magnetic property of a metal piece to be tested, wherein the magnetic measurement method comprises: providing an excitation device, wherein the excitation device comprises a first excitation core and a second excitation core Using the first exciting core and the second exciting core to clamp the metal piece to be tested; measuring a magnetic field strength provided by the excitation device by using a magnetic field strength measuring device; and using a magnetic flux density measuring device The magnetic flux density of the metal piece to be tested is measured. 如請求項第6項所述之磁性量測方法,其中該第一激磁鐵芯和該第二激磁鐵芯為C形鐵芯,且對稱地設置於該待測金屬片之一第一表面和一第二表面上,該待測金屬片之該第一表面係相對於該待測金屬片之該第二表面,該第一激磁鐵芯之凹部係朝向該待測金屬片之該第一表面,該第二激磁鐵芯之凹部係朝向該待測金屬片之該第二表面。 The magnetic measurement method of claim 6, wherein the first excitation core and the second excitation core are C-shaped cores, and are symmetrically disposed on a first surface of the metal piece to be tested and On a second surface, the first surface of the metal piece to be tested is opposite to the second surface of the metal piece to be tested, and the concave portion of the first magnetic field core faces the first surface of the metal piece to be tested The recess of the second exciting magnet core faces the second surface of the metal piece to be tested. 如請求項第6項所述之磁性量測方法,其中該磁通密度測量裝置為探針式磁通密度測量裝置。 The magnetic measurement method according to claim 6, wherein the magnetic flux density measuring device is a probe type magnetic flux density measuring device. 如請求項第6項所述之磁性量測方法,更包含將該磁場強度測量裝置設置於該待測金屬片上,以量測該激磁裝置所提供之磁場強度,其中該磁場強度測量裝置為異向磁阻磁 感應器或霍爾磁感應器。 The magnetic measurement method of claim 6, further comprising: setting the magnetic field strength measuring device on the metal piece to be tested to measure the magnetic field strength provided by the excitation device, wherein the magnetic field strength measuring device is different Magnetoresistive magnetism Sensor or Hall magnetic sensor. 如請求項第6項所述之磁性量測方法,更包含利用該磁場強度測量裝置來量測該激磁裝置之一驅動電流值,以獲得該激磁裝置所提供之磁場強度。 The magnetic measurement method according to claim 6, further comprising measuring the driving current value of the one of the excitation devices by using the magnetic field strength measuring device to obtain the magnetic field strength provided by the excitation device.
TW103123606A 2014-07-09 2014-07-09 System and method for measuring magnetic properties TWI515446B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW103123606A TWI515446B (en) 2014-07-09 2014-07-09 System and method for measuring magnetic properties

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW103123606A TWI515446B (en) 2014-07-09 2014-07-09 System and method for measuring magnetic properties

Publications (2)

Publication Number Publication Date
TWI515446B TWI515446B (en) 2016-01-01
TW201602610A true TW201602610A (en) 2016-01-16

Family

ID=55640275

Family Applications (1)

Application Number Title Priority Date Filing Date
TW103123606A TWI515446B (en) 2014-07-09 2014-07-09 System and method for measuring magnetic properties

Country Status (1)

Country Link
TW (1) TWI515446B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI804941B (en) * 2020-10-06 2023-06-11 湛積股份有限公司 Current sensor

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI804941B (en) * 2020-10-06 2023-06-11 湛積股份有限公司 Current sensor

Also Published As

Publication number Publication date
TWI515446B (en) 2016-01-01

Similar Documents

Publication Publication Date Title
JP5709695B2 (en) Stress-load type single plate magnetic tester
JP5527203B2 (en) Single plate magnetic tester and method for measuring magnetic properties of electrical steel sheet using the same
Zhu et al. Measurement of magnetic properties under 3-D magnetic excitations
Kai et al. Influence of stress on vector magnetic property under alternating magnetic flux conditions
JP4512079B2 (en) Apparatus and method for measuring magnetic properties and mechanical strength of thin steel sheet
Sievert Two-dimensional magnetic measurements-history and achievements of the workshop
Miyagi et al. Measurement of magnetic properties of nonoriented electrical steel sheet at liquid nitrogen temperature using single sheet tester
Cheng et al. Modeling of magnetic properties of GO electrical steel based on Epstein combination and loss data weighted processing
Gmyrek Single sheet tester with variable dimensions
Hamzehbahmani et al. Opportunities and precautions in measurement of power loss in electrical steel laminations using the initial rate of rise of temperature method
Yamagashira et al. Vector magnetic properties and 2-D magnetostriction of various electrical steel sheets under rotating flux condition
Ding et al. 2-D magnetic properties measurement system for electrical steel sheets considering laminated direction mechanical stress
Dou et al. An improved cross-yoke SST for accurate 1-D and 2-D magnetic testing of Fe-Si sheets
de La Barrière et al. A simple compensation method for the accurate measurement of magnetic losses with a single strip tester
TWI515446B (en) System and method for measuring magnetic properties
Tumański Modern methods of electrical steel testing—A review
JP2014112605A (en) Veneer magnetic characteristic measurement method and measurement apparatus
Swieboda et al. Nanocrystalline oval cut cores for current instrument transformer prototypes
Hihat et al. Normal permeability of grain non-oriented, grain oriented and amorphous electrical steel sheets
JP6015518B2 (en) Magnetic property measuring method and apparatus
JP2010236882A (en) Tester for testing magnetic characteristic of veneer of electromagnetic steel plate and method of measuring magnetic characteristics
JP2013185902A (en) Method and device for measuring crystal orientation
CN104678329A (en) Magnetic field sensing device and method
Saeed et al. Iron loss models under static stress for non-oriented and grain oriented steel
Yamamoto et al. Effects of compressive stress normal to the surface of non-oriented electrical steel sheets

Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees