TW201533450A - Current probe - Google Patents

Abstract

The present invention provides a current probe capable of keeping a connection part and an electric wire from being influenced by the slide of the current probe so as to prevent poor contact and spark in advance, and capable of not being influenced by the effects of inclination, unevenness, and level difference of a specimen surface so as to maintain a stable number of contact points and resistance values. A top surface (13b) of a probe body (11) is provided with a plurality of insertion holes (13c) for allowing a plurality of contacts (14) to be inserted therein. The contacts (14) can be arranged in the insertion holes (13c) in a sliding manner and be applied with force by a force applying device (15) along a protrusion direction.

Description

Current probe

The present invention relates to current probes for measuring resistance values, voltage values, and the like.

Conventionally, there is a current probe for inspection which can measure a resistance value, a voltage value, and the like, and the current probe is electrically connected by making a conductive tip end portion adjacent to a subject. For example, in the probe for large current used as the contact for charging/discharging inspection of the secondary battery, the contact that can be moved up and down is brought into contact with the electrode of the secondary battery, and is supplied from the charging/discharging device to the probe. Current is used for charge/discharge check. In such a probe for charging/discharging inspection or the like, in order to perform a check in order to turn on a relatively large current, a direct type in which the probe body to which the electric wire is connected is directly pressed against the subject is mainly used (Japanese: ) Probe.

For example, Patent Document 1 discloses a sleeve (Japanese: The drive mechanism is fixed to the positioning device, and the drive mechanism is moved up and down to press the probe body that is slidably supported by the drive mechanism against the direct current probe of the subject.

Prior art literature Patent literature

Patent Document 1: Japanese Unexamined Publication No. SHO 62-114366

However, in the case of the direct current probe as described above, it is necessary to attach and detach the electric wire when replacing the current probe, and thus there is a problem that the operation is complicated. For example, in the case of performing the charging/discharging inspection of the secondary battery, in order to arrange the secondary probes with the gaps as much as possible without gaps and to arrange the current probes in conjunction with the terminal pitch of the secondary batteries, it is necessary to operate in a limited space. . In the case where it is difficult to carry out the loading and unloading operation of the electric wire, the operation of attaching and detaching the electric wire when replacing the current probe becomes very troublesome.

In addition, in the case of direct current probes, the wiring and wires are also slid with the current probe during measurement (Japanese: ) Move together accordingly. At this time, for example, in the case where wiring is caused by wiring in a narrow space, and the electric wires interfere with each other, there is a possibility that an unexpected force is generated due to the movement of the wiring portion and the electric wire, thereby causing an unexpected contact failure, spark, or the like.

Further, in the technique described in Patent Document 1, when the tip end of the probe is formed into a sharp multi-apex shape, the tip end is connected to the imaginary plane formed by the sharp multi-vertex and the surface layer of the subject. Since the contact is made, the contact point cannot be changed correspondingly according to the unevenness, the inclination, and the like of the surface of the subject. Therefore, there is a problem in that it can only cope with a smooth surface that is not inclined, and its use is limited. In addition, even in the case of a smooth surface having no inclination, there is a problem that the contact state is unstable in the case of having a small waviness or the like. In addition, since it is necessary to process a plurality of vertices to an equal height, there is a problem that a high processing technique is required and the cost is increased.

Accordingly, an object of the present invention is to provide a current probe that prevents a wiring portion and an electric wire from being affected by slippage of a current probe, thereby preventing unintended contact failure, spark, and the like, and capable of preventing The number of contact points and the resistance value that are always stable without being affected by the inclination, the unevenness, the step, and the like of the surface layer of the subject.

The present invention has been made to solve the above problems, and the following contents are characterized.

The first item of claim 1 is characterized in that it comprises: a probe body having a wiring portion for connecting the electric wires; a plurality of contacts arranged to protrude at a tip end of the probe body; and a force applying device For biasing the contact in a protruding direction, a plurality of insertion holes for inserting the plurality of contacts are provided on a top end surface of the probe body, and the contacts are slidably disposed in the The inside of the insertion hole is described, and is biased by the urging means in the protruding direction.

On the basis of the feature of the first item of the claim item, the request item 2 is characterized in that the contact has a circumferential surface whose diameter gradually increases as it goes toward the tip end side.

On the basis of the first item or the second item of the claim item, the request item 3 is characterized in that the probe body comprises: a socket having the terminal portion; a holder having a The insertion hole can be detached from the probe body by separating the holder from the sleeve.

On the basis of the third feature of the claim, the request item 4 is characterized in that the urging means is a spring having a diameter of the rear end portion larger than that of the other portions, and is formed on the inner peripheral surface of the insertion hole. There is a step portion for engaging with the rear end portion of the urging device.

In the first item of claim 1, a plurality of insertion holes for inserting a plurality of contacts are provided on a distal end surface of the probe body, and the contacts are slidably disposed inside the insertion holes, and are applied The force device applies a force in the protruding direction. That is, the contact slides relatively independently of the probe body ( Therefore, when the contact is pressed against the subject and is slid, the probe main body to which the electric wire is connected is not affected by the sliding. Therefore, even if the contact slides, the wiring portion and the electric wire do not move, so that the wiring portion and the electric wire are not subjected to an unexpected force, and it is possible to suppress an unintended contact failure, a spark, or the like.

Further, since the plurality of contacts are independently slid, the contacts can be individually operated along the surface shape of the subject. Therefore, the number of stable contact points and the resistance value can be always maintained without being affected by the inclination, the unevenness, the step, and the like of the surface layer of the subject, and therefore, heat generation and sparking at the time of energization can be suppressed.

Further, in the second aspect of the claim, the contact has a tapered peripheral surface whose diameter gradually increases toward the tip end side. With such a configuration, the inclination of the contact changes greatly when the contact slides, and the tip end portion of the contact pressed against the subject rubs against the surface of the subject.

That is, in a state before the contact is pressed, a portion having a relatively small diameter is in contact with the opening edge of the insertion hole, and the posture of the contact is in a state of being largely inclined with respect to the insertion hole. In this state, when the contact is pressed against the subject, the contact is pressed into the inside of the insertion hole, but at this time, the diameter of the circumferential surface of the contact gradually increases, so that the contact with respect to the insertion hole is inclined The head posture is guided in parallel with the insertion hole. Since the posture of the contact changes as described above, the distal end portion of the contact slides on the surface of the subject to rub against the surface of the subject.

Since the tip end portion of the contact is rubbed against the surface of the subject, the high-resistance film such as the oxide film or the high-resistance coating layer formed on the surface layer of the subject can be removed, so that the stability of the low resistance can be ensured. s contact.

Further, when the contact is pushed in and pushed into the insertion hole, the diameter of the circumferential surface of the contact gradually increases, so that the peripheral surface of the contact is easily brought into contact with the insertion hole, so that the shortest distance can be ensured. A reliable power-on path ensures stable contact with low resistance.

Further, in the third aspect of the invention, the probe body includes: a sleeve having the terminal portion; and a holder having the insertion hole, the contact being capable of being separated by separating the sleeve from the holder And the force applying device is detached from the probe body. According to this configuration, it is not necessary to attach and detach the electric wire when replacing the easily worn contact and the urging device, so that the maintainability can be improved. In addition, it is also possible to replace only the contacts, the urging means or the holder without replacing the entire current probe, and thus it is also possible to reduce the running cost.

Further, in the fourth aspect of the invention, the urging means is a spring having a diameter of the rear end portion larger than a diameter of the other portion, and an inner peripheral surface of the insertion hole is formed with a rear end portion for the urging means Since the step portion is engaged, the spring can be attached and detached only by inserting the spring into the insertion hole or pulling out the spring from the insertion hole. Therefore, the operability and maintainability of assembly can be improved.

10‧‧‧current probe

11‧‧‧ Probe body

11a‧‧‧through hole

12‧‧‧ sleeve

12a‧‧‧Wiring

12b‧‧‧External thread

12c‧‧‧Supporting and fixing department

13‧‧‧ Holder

13a‧‧‧Threaded Department

13b‧‧‧ top surface

13c‧‧‧ insertion hole

13d‧‧‧Steps

14‧‧‧Contacts

14a‧‧‧Top protrusion

14b‧‧‧Cylinder

14c‧‧‧Week

14d‧‧‧Connecting Department

15‧‧‧Power device

15a‧‧‧Great Path Department

16, 17‧‧‧Insulated collar

20‧‧‧Voltage measurement probe

21‧‧‧Sleeve

22‧‧‧Cylinder

23‧‧‧Plunger

24‧‧‧Plunger spring

25‧‧‧

Figure 1 is an external view of a current probe.

Fig. 2 is a view showing the internal configuration of a current probe.

Fig. 3 is an exploded perspective view of the current probe viewed from the front.

Fig. 4 is an exploded perspective view of the current probe viewed from the rear.

Fig. 5(a) is a side view of the contact, and Fig. 5(b) is a side view of the contact to which the force applying means is attached.

Figure 6 is a view for explaining the attachment or detachment of the contacts with respect to the probe body.

Fig. 7 is a view showing a change in the posture of the contact in response to the sliding of the contact.

Fig. 8 is a view showing the internal structure of a probe for voltage measurement.

Embodiments of the present invention will be described with reference to the drawings.

The current probe 10 of the present embodiment is for measuring a resistance value, a voltage value, and the like of the subject, and the current probe 10 is electrically connected to the subject by making the conductive tip adjacent to the subject. As shown in FIG. 1, the current probe 10 ensures contact area by contact with a subject at a plurality of points on the tip end, and can suppress heat generation even when used under a large current.

As shown in FIGS. 1 and 2, the current probe 10 includes a probe body 11, a contact 14, and a force applying device 15.

The probe main body 11 is a rod-shaped member as shown in FIGS. 1 and 2, and has a wiring portion 12a for connecting an electric wire at a rear end portion of the probe main body 11, and has a front end portion of the probe main body 11 A plurality of insertion holes 13c. The probe main body 11 has a through hole 11a penetrating in the axial direction, and the voltage measuring probe 20 to be described later can be attached to the through hole 11a so as to penetrate the through hole 11a.

The probe main body 11 of the present embodiment is configured by connecting two elements before and after. Specifically, it includes a sleeve 12 having the terminal portion 12a, a holder 13 having the insertion hole 13c, and the two members of the sleeve 12 and the holder 13 joined in the front-rear direction. As shown in Fig. 6, the sleeve 12 includes an externally threaded portion 12b, and the holder 13 includes an internal threaded portion 13a, and the sleeve 12 and the holder 13 can pass the externally threaded portion 12b and the inner portion The threaded portions 13a are screwed to each other and joined. Further, in the present embodiment, the sleeve 12 is formed with an external thread, and the holder 13 is formed with an internal thread. However, the present invention is not limited thereto, and the sleeve 12 may be internally threaded, and the holder 13 may be formed. An external thread is formed. Further, the method of connecting the sleeve 12 to the holder 13 is not limited to the screw-in type, and may be another well-known method (fitting, press-fitting, locking lever, etc.).

The sleeve 12 has a wiring portion 12a for connecting electric wires as described. An electric wire connected to the wiring portion 12a and a measuring device (for example, a charging/discharging device for performing charging/discharging inspection of the secondary battery) Connected, whereby the current probe 10 is electrically connected to the measuring device.

Further, the sleeve 12 includes a support fixing portion 12c for fixing the current probe 10 to the lifting device. Specifically, for example, a hole is formed in a synthetic resin plate, the current probe 10 is inserted through the hole, and the support fixing portion 12c is engaged and fixed to the hole of the plate. The plate to which the current probe 10 is fixed as described above is disposed to face the subject so as to be in contact with/detachable from the subject. When the electrical connection is to be established, the plate is brought close to the subject, and the distal end of the current probe 10 (more specifically, the contact 14 to be described later) can be pressed against the subject. The subject is in contact.

The holder 13 is formed to be detachable from the sleeve 12, and a plurality of insertion holes 13c are formed in the distal end surface 13b. The plurality of insertion holes 13c are formed to penetrate in the front-rear direction and are formed to have a substantially constant diameter, but only the diameter of the rear end portion is formed to be a slightly larger diameter. The diameter of a part of the insertion hole 13c is formed to have a large diameter as described above, so as to be near the opening of the rear side of the insertion hole 13c as shown in Fig. 6 (in other words, the opening of the insertion hole 13c facing the sleeve 12) The inner peripheral surface is formed with a step portion 13d. This step portion 13d is for engaging with the large diameter portion 15a of the urging device 15 to be described later. As shown in FIG. 2 and the like, a pair of contacts 14 and a biasing device 15 are inserted into the insertion hole 13c.

The contact 14 is slidably disposed inside the insertion hole 13c of the probe main body 11, and is provided to protrude at the distal end of the probe main body 11. The contact 14 is a member that is pressed against the subject to form an electrical connection. As shown in Fig. 5, the contact 14 has a substantially conical tip end projection 14a at the front portion of the cylindrical portion 14b. The distal end projection 14a is formed in a shape having a sharp distal end so as to be able to penetrate the high-resistance coating formed on the surface of the subject. Further, a connecting portion 14d for connecting the urging means 15 is formed at the rear portion of the cylindrical portion 14b. As shown in FIG. 5( b ), by pressing the connecting portion 14 d into the urging device 15 , the contact 14 can be coupled to the urging device 15 .

Further, as shown in FIG. 5, the cylindrical portion 14b of the contact 14 has a tapered peripheral surface 14c whose diameter gradually increases toward the distal end side. For the purpose of having such a tapered peripheral surface 14c, it is performed later Detailed description.

The urging device 15 is a spring shown in FIG. 5(b) and has a large diameter portion 15a having a slightly larger diameter at the rear end portion. As shown in FIG. 6, when the urging device 15 is assembled, the end of the urging device 15 opposite to the large diameter portion 15a is coupled to the contact 14, and then the urging device 15 is coupled with the contact 14 One side starts to be inserted into the insertion hole 13c. When the urging means 15 is inserted into the insertion hole 13c, it is inserted from the back side of the holder 13 (the side facing the sleeve 12). When the urging device 15 is inserted into the insertion hole 13c as described above, the step portion 13d formed on the inner circumferential surface of the insertion hole 13c is engaged with the large diameter portion 15a of the urging device 15, and the urging device 15 can no longer be moved. The state inserted in the back side. When the holder 13 is coupled to the sleeve 12 in this state, the large-diameter portion 15a of the biasing device 15 is sandwiched by the step portion 13d of the insertion hole 13c and the sleeve 12, so that the biasing means 15 and the contact can be fixed. The position of the head 14.

Further, in the case where the urging device 15 and the contact 14 are to be detached from the probe main body 11 due to wear of the urging device 15, the contact 14, or the like, only the holder 13 is separated from the sleeve 12, The urging means 15 and the contacts 14 can be easily detached from the back side of the holder 13.

When the urging device 15 and the contact 14 are placed in the insertion hole 13c as described above, as shown in FIGS. 1 and 2, the contact 14 is biased by the urging means 15 in the protruding direction, and the urging means 15 exerts a large amount of force. The contacts 14 are in a state of protruding from the tip end of the probe body 11. Therefore, when the probe main body 11 fixed to the resin plate or the like is brought close to the subject, the plurality of contacts 14 can be pressed against the subject. Further, the contact 14 pressed against the subject is pressed against the inside of the insertion hole 13c against the urging force of the urging means 15.

Further, as shown in FIG. 5( b ), the biasing device 15 is coupled to the contact 14 by a flange-shaped retaining member formed on the connecting portion 14 d of the contact 14 . At this time, the urging device 15 and the contact 14 are formed to be bent at the joint portion of the urging device 15 and the contact 14 to be in Japanese. For example, the tilt-wound spring is engaged with the flange-shaped retaining member, so that the biasing device 15 and the contact 14 can be coupled into Japanese. "The shape of the word. Because the force applying device 15 and the contact 14 are connected into Japanese as such" In the shape of a word, as shown in Fig. 7, when the urging means 15 and the contact 14 are placed in the insertion hole 13c, the contact 14 is in a state of being inclined with respect to the insertion hole 13c. When the contact 14 in the inclined state of 13c is press-fitted into the inside of the insertion hole 13c, a part of the circumferential surface 14c of the cylindrical portion 14b slides in contact with the opening edge of the insertion hole 13c. At this time, as described above, the cylindrical portion 14b The circumferential surface 14c is a tapered shape whose diameter gradually becomes larger, so that the inclination of the contact 14 changes as the contact 14 is pressed. Specifically, as the contact 14 is pressed, it is inclined with respect to the insertion hole 13c. The posture of the contact 14 is gradually guided to be parallel to the insertion hole 13c.

By changing the posture of the contact 14 like this, the distal end portion of the contact 14 slides on the surface of the subject (in the example of Fig. 7, the distal end portion of the contact 14 is moved by the distance indicated by the reference symbol G). ). Since the distal end portion of the contact 14 slides on the surface of the subject and rubs against the surface of the subject, the high-resistance film such as the oxide film or the high-resistance coating layer formed on the surface layer of the subject can be removed. Thus, a stable contact with low resistance can be ensured.

Further, the current probe 10 of the present embodiment has a voltage measuring probe 20 inside the probe main body 11, and the voltage measuring probe 20 can be used as a four-terminal measurement voltage measuring readout needle (Japanese: )use. As shown in FIGS. 2 to 4, the voltage measuring probe 20 is fixed via the insulating collars 16, 17. Therefore, the voltage measuring probe 20 is insulated from the probe main body 11 and the contacts 14. Further, a lug 25 capable of connecting an electric wire is provided at a rear end portion of the voltage measuring probe 20, and can be electrically connected to a measuring device (not shown) for measuring a four-terminal by an electric wire. In this manner, the voltage measuring probe 20 can be connected to the measuring device by a system that is electrically independent of the probe body 11.

As shown in FIG. 8, the voltage measuring probe 20 includes a plunger 23 that can be pressed against the subject, a plunger spring 24 for biasing the plunger 23 in the protruding direction, and a cylindrical cylinder. 22, which is used to guide the sliding of the plunger 23; a sleeve 21 for accommodating these elements. The distal end portion of the plunger 23 is sharp, and by pressing the sharp distal end against the subject, the high-resistance film of the surface layer of the subject can be pierced. Further, the plunger 23 pressed against the subject slides toward the inside of the cylinder 22 against the urging force of the plunger spring 24. Move without being overloaded.

As described above, according to the present embodiment, a plurality of insertion holes 13c into which the plurality of contacts 14 are inserted are provided in the distal end surface 13b of the probe main body 11, and the contacts 14 are slidably disposed in the insertion holes. The inside of the 13c is biased by the urging means 15 in the protruding direction. In other words, since the contact 14 and the probe body 11 slide relative to each other independently, when the contact 14 is pressed against the subject to slide, the probe main body 11 to which the electric wire is connected is not affected by the sliding. Therefore, even if the contact 14 slides, the wiring portion 12a and the electric wire do not move. Therefore, the wiring portion 12a and the electric wire are not subjected to an unexpected force, and an unexpected contact failure, spark, or the like can be suppressed.

Further, since the plurality of contacts 14 are independently slid, the contacts 14 can be individually operated along the surface shape of the subject. Therefore, the number of stable contact points and the resistance value can be always maintained without being affected by the inclination, the unevenness, the step, and the like of the surface layer of the subject, and therefore, heat generation and sparking at the time of energization can be suppressed.

Further, the contact 14 has a tapered peripheral surface 14c whose diameter gradually increases toward the tip end side. With such a configuration, when the contact 14 slides, the inclination of the contact 14 largely changes, and the tip end portion of the contact 14 pressed against the subject rubs against the surface of the subject.

That is, in a state before the contact 14 is pressed in, a portion having a relatively small diameter is in contact with an opening edge of the insertion hole 13c, and a posture of the contact 14 is largely inclined with respect to the insertion hole 13c (the drawing in Fig. 7) Mark the state shown in A). In this state, when the contact 14 is pressed against the subject, the contact 14 is pushed into the insertion hole 13c. However, at this time, the diameter of the peripheral surface 14c of the contact 14 gradually increases, and thus The posture of the contact 14 in which the insertion hole 13c is inclined is guided in parallel with the insertion hole 13c (the state shown by the reference symbol B in Fig. 7). When the posture of the contact 14 is changed as described above, the distal end portion of the contact 14 slides on the surface of the subject to rub against the surface of the subject.

Since the tip end portion of the contact 14 rubs against the surface of the subject, the body can be removed. Since a high-resistance film such as an oxide film or a high-resistance coating formed on the surface layer of the subject is formed, stable contact with low resistance can be ensured.

Further, when the contact 14 is pushed in and pushed into the insertion hole 13c, the diameter of the circumferential surface 14c of the contact 14 gradually increases, so that the circumferential surface 14c of the contact 14 is easily brought into contact with the insertion hole 13c. The shortest and reliable energization path can be ensured, ensuring stable contact with low resistance.

Further, the probe main body 11 includes a sleeve 12 having the wiring portion 12a, and a holder 13 having the insertion hole 13c, and the contact 14 can be separated by separating the holder 13 from the sleeve 12. The force applying device 15 is detached from the probe body 11. According to this configuration, it is not necessary to attach and detach the electric wire when replacing the contact 14 and the urging device 15 which are easily consumed, so that the maintainability can be improved. Further, it is also possible to replace only the contact 14, the urging means 15, or the holder 13 without replacing the entire current probe 10, so that the running cost can also be reduced.

Further, the urging means 15 is a spring having a diameter of the rear end portion larger than the diameter of the other portion, and a step portion for engaging with the rear end portion of the urging means 15 is formed on the inner peripheral surface of the insertion hole 13c. 13d, therefore, the spring can be attached and detached only by inserting the spring into the insertion hole 13c or pulling out the spring from the insertion hole 13c. Therefore, the operability and maintainability of assembly can be improved.

Further, since the high current probe 10 includes the voltage measuring probe 20, the high current probe 10 can also be used for four-terminal measurement, and high-precision measurement can be performed.

Further, the shape of the holder 13 and the arrangement of the contacts 14 are not limited to the embodiment. According to the present embodiment, the shape of the holder 13 and the arrangement of the contacts 14 can be freely set. Therefore, the shape of the optimum holder 13 and the arrangement of the contacts 14 corresponding to the contact faces of the various subjects can be employed. For example, the distal end surface 13b of the holder 13 of the present embodiment has a circular shape, but may be a quadrangular shape, a triangular shape, a crescent shape or the like. Since it is possible to select the optimum corresponding to the contact surface of the subject like this Since the shape of the holder 13 and the contact 14 are maintained, the maximum number of contact points can be ensured.

10‧‧‧current probe

11‧‧‧ Probe body

12‧‧‧ sleeve

12a‧‧‧Wiring

12c‧‧‧Supporting and fixing department

13‧‧‧ Holder

13b‧‧‧ top surface

13c‧‧‧ insertion hole

14‧‧‧Contacts

20‧‧‧Voltage measurement probe

Claims (4)

A current probe, comprising: a probe body having a wiring portion for connecting an electric wire; a plurality of contacts arranged to protrude at a top end of the probe body; a device for biasing the contact in a protruding direction, and a plurality of insertion holes for inserting the plurality of contacts are provided on a top end surface of the probe body, the contacts being slidable It is disposed inside the insertion hole and is biased by the urging means in the protruding direction. The current probe according to claim 1, wherein the contact has a circumferential surface whose diameter gradually increases toward the tip end side. The current probe of claim 1 or 2, wherein the probe body comprises: a sleeve having the terminal portion; and a holder having the insertion hole The holder is separated from the sleeve and the contact and the force applying device can be detached from the probe body. The current probe according to claim 3, wherein the urging means is a spring having a diameter at the rear end portion larger than a diameter of the other portion, and is formed on the inner peripheral surface of the insertion hole for applying force A stepped portion where the rear end portion of the device is engaged.