TW201520568A - Test and maintenance system and method - Google Patents

Abstract

A test and maintenance system comprises a data measurement unit, a data transmission unit and a computer, wherein the computer comprises a storage unit for storing at least one predetermined data and at least one measuring position data. The data measurement unit is connected to at least one signal measuring position of a test card according to the measuring position data to acquire at least one measuring data. Further, the computer is able to compares the predetermined data and the measuring data to generate a detection result. A user is able to replace a unit of the test card according to the detection result so as to improve the efficiency of maintenance of the test card.

Description

Test maintenance system and method thereof

The invention relates to a test maintenance system platform, in particular to a test maintenance system applied to the repair of a card to be tested.

The information industry is booming, and the products launched are changing with each passing day, which has caused the competition for product prices to slow down. Also, due to the rise of consumer awareness and the rapid transmission of online information, the efficiency and standard of after-sales service have become an important basis for influencing the survival of information brands. In order to improve service standards, more auxiliary equipment can be invested. For example, the analysis and planning of the maintenance process is carried out, and the maintenance work is planned to improve the maintenance efficiency and quality, and the customer satisfaction is achieved to achieve corporate profit.

The use of feature cards (such as display cards, network cards, disk array cards or other special purpose function cards) is particularly broad and important in the current multimedia era. The more efficient the function card, the more complicated the design structure. Due to the different environments and habits, there are often many problems in use and even failures. When the function card fails and needs to be repaired, the most difficult part is to find the damaged material. According to the traditional maintenance process, the maintenance personnel need to understand the circuit design of the function card, understand the characteristics of each material, and have the basic maintenance capability, and the time and success rate required for maintenance are limited by the technical ability and experience of the maintenance personnel. , resulting in the maintenance of the threshold and cost.

However, in fact, each function card (such as a display card) with the same function has common features for repairing materials and methods, so if the function card maintenance process can be analyzed as described above, And planning to improve maintenance operations in a planned manner, for example, to integrate and learn the repaired experience through a system to provide future maintenance assistance. In this way, not only can the maintenance efficiency and quality of the function card be increased, but also the labor cost can be reduced, so that even those who do not have the maintenance technology can complete the repair through the system.

An object of the present invention is to provide a test maintenance system and a method thereof, wherein a user can find a corresponding signal measurement position from a card to be tested according to the measurement position information provided by a computer device, for the card to be tested. The signal measurement position is measured to take out a measurement data, and then the measured data is compared with a preset data stored in the computer device to generate a detection result, and the user further uses the detection result according to the detection result. Decide whether to replace the material on the signal measurement position of the card to be tested. Here, the detection and maintenance of the card to be tested by the instruction of the computer device can improve the efficiency and correctness of the detection and maintenance of the card to be tested.

Another object of the present invention is to provide a test maintenance system and a method thereof. The computer device further provides relevant maintenance information, analyzes the cause of damage to the previously tested card and the material, so that the user can refer to the previous maintenance experience for follow-up. Detection and maintenance actions of other cards to be tested.

In order to achieve the above object, the present invention provides a test maintenance system, comprising: a data measurement unit, which is connected to at least one signal measurement position of a card to be tested, and at least one measurement is taken from a signal measurement position of the card to be tested. a data transmission unit connected to the data measurement unit; and a computer device connected to the data transmission unit and including a storage unit for storing at least one preset data and at least one measurement position information, wherein the measurement position information includes The signal measurement position of the card is measured, and the computer device obtains the measurement data from the data measurement unit through the data transmission unit, and compares the measurement data with the corresponding preset data to generate a detection result.

The invention further provides a test and maintenance method, comprising the following steps; The model of the test card provides at least one measurement position information of the card to be tested; according to the measurement position information, the measurement position of at least one signal of the test card is measured, and at least one measurement data is taken; and the comparison quantity is obtained. Measuring data and at least one preset data, and generating a test result.

10‧‧‧Test maintenance system

11‧‧‧Computer equipment

111‧‧‧ storage unit

121‧‧‧Measurement location information

123‧‧‧Maintenance information

13‧‧‧Data Transfer Unit

14‧‧‧Measurement data

15‧‧‧Data Measurement Unit

17‧‧‧Test card

171‧‧‧Materials

172‧‧‧ Signal measurement position

173‧‧‧Materials

174‧‧‧ Signal measurement position

175‧‧‧Materials

176‧‧‧ Signal measurement position

19‧‧‧Test signal supply unit

1 is a schematic view showing the connection of a test maintenance system according to a first embodiment of the present invention.

Figure 2 is a flow chart showing the steps of the test and maintenance method of the second embodiment of the present invention.

Figure 3 is a flow chart showing the steps of the test and maintenance method of the third embodiment of the present invention.

4A and 4B are flow charts showing the steps of the test maintenance method according to the fourth embodiment of the present invention.

Please refer to FIG. 1 , which is a schematic diagram of the connection of the test maintenance system of the first embodiment of the present invention. As shown, the test maintenance system 10 of the first embodiment of the present invention includes a computer device 11, a data transmission unit 13, and a data measurement unit 15. The computer device 11 is connected to the data measuring unit 15 through the data transmission unit 13, and the at least one measurement data 14 is extracted from the card under test 17 through the data measuring unit 15 and the data transmission unit 13. The data transmission unit 13 can be, but is not limited to, a universal sequence bus. The measurement data 14 can also be a voltage value or a waveform diagram. Furthermore, the card under test 17 can also be a display card, a network card, a disk array card or a special purpose function card.

In general, the circuitry on the card under test 17 is quite complex and may include a plurality of components 171/173/175 and a plurality of signal measurement locations 172/174/176. In the embodiment of the present invention, the user can detect and repair the damaged card 17 to be tested according to the instruction of the test maintenance system 10. In one embodiment of the present invention, the computer device 11 includes a storage unit 111 for storing at least one measurement location information 121 and at least one preset data 123. For example, the computer device 11 can be, but not limited to, a personal computer or a server. .

In the actual application, the user can input the model data of the card 17 to be tested into the computer device 10. The computer device 10 will find the corresponding measurement position information 121 and the preset data 123 from the storage unit 111 according to the input model data. The measurement location information 121 includes the model of the card 17 to be tested and the signal measurement location 172/174/176 of the card 17 to be tested, and the preset data 123 includes corresponding signal measurement locations 172/174. /176 predetermined value.

The data measurement unit 15 can be, but is not limited to, an interface oscilloscope. The data measuring unit 15 is electrically connected to the computer device 11 through the data transmission unit 13. The user can find the corresponding signal measurement position 172/ on the card 17 to be tested according to the measured position information 121 provided by the computer device 11. 174/176. The data measuring unit 15 is connected to the signal measuring position 172/174/176 on the card 17 to be tested, and the measuring data 14 is taken out from the signal measuring position 172/174/176. In an embodiment of the present invention, the card 17 to be tested may be disposed on a test signal supply unit 19. For example, the test signal supply unit 19 may be, but not limited to, a printed circuit board, and the test signal supply unit 19 may provide the card to be tested. The required test signals, such as the test signals provided, can be, but are not limited to, voltage or current to drive the card 17 to be tested.

The computer device 11 is electrically connected to the data transmission unit 13 and can obtain the measurement data 14 taken by the data measurement unit 15 from the card to be tested 17 through the data transmission unit 13. The preset data 123 stored in the storage unit 11 of the computer device 11 can be a predetermined value of the card 17 to be tested, and the computer device 11 can compare the measurement data 14 of the card 17 to the corresponding preset data 123 and generate a detection. As a result, the user can know whether the feeding member 171/173/175 of the card to be tested 17 is normal according to the detection result, and thus know whether it is necessary to replace the feeding member 171/173/175 of the card 17 to be tested. For example, the measurement data 14 can be transmitted to the storage unit 111, and the measurement data 14 and the preset data 123 can be compared.

The card to be tested 17 includes a plurality of materials 171/173/175 and a plurality of signal measuring positions 172/174/176, such as a first material member 171, a second material member 173, a third material member 175, and a first message. The measurement position 172, the second measurement position 174 and the third measurement position 176, wherein the first signal measurement position 172 corresponds to the first material member 171, and the second signal measurement position 174 corresponds to the first The two material members 173 and the third signal measurement position 176 correspond to the third material member 175.

In the actual application, the user can connect the data measuring unit 15 to the first signal measuring position 172 according to the indication of the measured position information 121 provided by the computer device 11, and obtain the first signal measurement of the card 17 to be tested. The measurement data 14 of the location 172, such as the measurement data 14, can be the first detection voltage. The computer device 11 can find the preset data 123 corresponding to the first signal measuring position 172 and/or the first material 171 of the card 14 to be tested in the storage unit 111. For example, the preset data 123 can be the first Preset voltage. The computer device 11 can further compare the measurement data 14 and the preset data 123, and generate a detection result, and the computer device 11 and/or the user can decide whether to replace the first material 171 on the card 17 to be tested according to the detection result. For example, the computer device 11 can compare the first detection voltage and the first preset voltage. When the voltage difference between the first detection voltage and the first preset voltage is greater than a preset value, the computer device 11 issues an indication to replace the first material 171. On the contrary, when the voltage difference between the first detection voltage and the first preset voltage is less than the preset value, the computer device 11 issues an indication that the first material 171 is not required to be replaced. After the detection of the first material member 171 and/or the first signal measurement position 172 is completed, the detection of other material parts and/or other signal measurement positions may be continued, for example, the second material member 173 and the third material member 175. The detection of the second signal measurement position 174 and/or the third signal measurement position 176 is the same as the first material 171 and/or the first signal measurement position 172, and will not be described herein.

In addition, in another embodiment of the present invention, the storage unit 111 can also store a maintenance information 125, wherein the maintenance information 125 includes the measurement location information of the same or similar card 17 to be tested, the corresponding material and the preset data. To provide user queries. When the measurement location information 121 stored by the storage unit 111 fails to complete the maintenance of the card under test 15, the user can refer to the maintenance information 125 for subsequent detection and maintenance operations. Of course, in different embodiments, maintenance information 125 The circuit diagram of the card to be tested 17 and the predetermined position of the material 171/173/175 may also be included, so that the user can check whether the card to be tested 17 has a line connection according to the maintenance information 125, or the material 171/ The problem caused by the 173/175 position setting error.

In addition, the computer device 11 can also store the previously replaced material parts 171/173/175, the corresponding measurement position information 172/174/176, the measurement data 14 and the model number of the card to be tested 17 in the storage unit. Within 111, for future reference or repair.

The computer device 11 can provide specific measurement position information 121 and related maintenance information 125, etc., but in actual application, the information provided by the computer device 11 can be increased or decreased by the user. In addition, the setting of the comparison condition 123 of the preset information 123 and the measurement data 14 provided by the computer device 11 for the card 17 to be tested and the preset data 123 may also be set by the user.

Please refer to FIG. 2, which is a flow chart showing the steps of the test maintenance method of the second embodiment of the present invention. Please refer to Figure 1 as shown in the figure below. The user can detect and repair the card 17 to be tested according to the following steps, and it is beneficial to improve the efficiency and correctness of the detection and maintenance of the card 17 to be tested.

The computer device 11 provides the corresponding measurement position information 121 according to the model of the card 17 to be tested, as shown in step 21. In this step, the user first registers the model of the card 17 to be tested on the computer device 11, and then the computer device 11 will find the measurement position associated with the card 17 to be tested in the storage unit 111 according to the registered data. Information 121. Then, according to the measurement position information 121 provided by the computer device 11, the data measurement unit 15 is connected to the signal measurement position 172/174/176 of the card 17 to be tested indicated by the measurement position data 121, and the test is to be tested. The signal 17 of the card 17 measures the measurement data 14 of the position 172/174/176 as shown in step 23.

The computer device 11 can obtain the measurement data 14 of the card 17 to be tested from the data measurement unit 15 through the data transmission unit 13 and further compare with the measurement data 14 of the test card 17 and the preset data 123 stored in the storage unit 111. A test result is generated, as shown in step 25. Then, based on the comparison result, it is decided whether to replace the material 171/173/175 on the card to be tested 17, as in step 27 Shown.

In an embodiment of the invention, the card to be tested 17 includes a plurality of materials 171/173/175 and a plurality of signal measuring positions 172/174/176, wherein each of the materials 171/173/175 corresponds to each signal. The measurement position 172/174/176 includes, for example, a first material member 171, a second material member 173, a third material member 175, a first signal measurement position 172, a second signal measurement position 174, and a third signal measurement. Position 176, wherein the first signal measurement position 172 corresponds to the first material 171, the second signal measurement position 174 corresponds to the second material 173, and the third signal measurement position 176 corresponds to the third Material 175. Therefore, in actual application, the above steps 21 to 27 may be repeated to detect other untested materials 171/173/175 and/or signal measurement positions 172/174/176 on the card 17 to be tested.

In an embodiment of the invention, the difference between the measurement data 14 of the card 17 to be tested and the preset data 123 stored in the storage unit 111 is within a predetermined range of values. The difference between the equivalent test data 14 and the preset data 123 is outside the predetermined value range (ie, greater than the predetermined value), and represents that the working parameter of the card 17 to be tested is abnormal at the signal measurement position 172/174/176. The material 171/173/175 corresponding to the signal measurement position 172/174/176 should be replaced.

On the other hand, if the difference between the measurement data 14 and the preset data 123 is within a predetermined value range (ie, less than or equal to the predetermined value), it means that the card 17 to be tested is at the signal measurement position 172/174/176. The working parameters are normal, and the corresponding material 171/173/175 does not need to be replaced. The computer device 11 and/or the operator can further determine whether the card 17 to be tested has other signal measurement positions 172/174/176 and/or the materials 171/173/175 need to be detected.

Please refer to FIG. 3, which is a flow chart showing the steps of the test maintenance method according to the third embodiment of the present invention. In the embodiment of the present invention, the computer device 11 provides the corresponding measurement position information 121 according to the model of the card 17 to be tested, as shown in step 21. Connect The data measuring unit 15 is connected to the signal measuring position 172/174/176 of the card 17 to be tested indicated by the measuring position data 121 according to the measured position information 121 provided by the computer device 11, and the card to be tested is captured. The signal of 17 measures the measurement data 14 of the position 172/174/176, as shown in step 23. The computer device 11 can obtain the measurement data 14 of the card 17 to be tested from the data measurement unit 15 through the data transmission unit 13 and further compare with the measurement data 14 of the test card 17 and the preset data 123 stored in the storage unit 111. A test result is generated, as shown in step 25.

The computer device 11 and/or the operator can determine whether the signal measurement position 172/174/176 of the card 17 to be tested and the corresponding material 171/173/175 are damaged according to the detection result. If the test result does not meet the requirements, for example, if the test result does not fall within the predetermined value range, it means that the material 171/173/175 corresponding to the signal measurement position 172/174/176 is damaged and needs to be replaced with the signal quantity. The corresponding position 172/174/176 is measured as 171/173/175, as shown in step 27. After the replacement of the material 171/173/175 is completed, the card 17 to be tested can be further tested for normal operation, as shown in step 33. On the other hand, if the test result meets the requirements, for example, the test result falls within the predetermined value range, it means that the material 171/173/175 corresponding to the signal measurement position 172/174/176 is not damaged, and can be further tested. Test card 17 is operating normally, as shown in step 33.

The method of testing whether the card 17 to be tested is normally operated (step 33) may be, but not limited to, loading the card 17 to be tested on a test fixture (not shown), and providing the signal required for the card 17 to be tested through the test fixture and Power supply to test whether the card under test 17 is operating normally. For example, when the card to be tested 17 is a display card, the display card can be loaded on the test fixture, and the test fixture is still connected to a display unit, and the screen displayed by the display unit of the test fixture is connected to determine whether the display card is working normally. While the repair is completed, the user can record the replaced material 171/173/175, the corresponding measurement position information 121, the corresponding measurement data 14 and/or the corresponding detection result in the computer device 11 The storage unit 111 is used as a reference for the maintenance of the card 17 to be tested in the future.

If the test card 17 is in normal operation, the detection and maintenance of the card 17 to be tested has been completed. On the other hand, if the card to be tested 17 still fails to operate normally, it means that there is still a damaged material 171/173/175 on the card to be tested 17, and then steps 21 to 33 will be repeated, and according to the instruction of the computer device 11, The other signal measurement positions 172/174/176 on the test card 17 are measured to find and replace other damaged materials 171/173/175 on the card 17 to be tested until the card 17 to be tested can operate normally.

Please refer to FIGS. 4A and 4B for a flow chart of the steps of the test and maintenance method according to the fourth embodiment of the present invention. This embodiment includes the test and maintenance steps of the third embodiment, such as steps 21, 23, 25, 31, 27, and 33. The above steps have been disclosed in the third embodiment and the third embodiment of the present invention, and will not be described herein. . With reference to FIG. 1 , the embodiment of the present invention further includes other steps, mainly through providing the maintenance information 125 through the computer device 11 , and the user uses the maintenance information 125 to find out that the test card 17 may need to be tested or repaired. Signal measurement position 172/174/176 and/or material 171/173/175.

When the test card 17 is tested for normal operation, as shown in step 33, if the test result is that the card to be tested 17 fails to operate normally, the computer device 11 can further determine whether there are other measured position information without over-measurement. 121. As shown in step 41, if the computer device 11 determines that there are still other measurement position information 121 that has not been over-measured, other unmeasured measurement position information 121 is provided, and steps 23 to 33 are repeated. On the other hand, if the computer device 11 determines that there is no other measurement location information 121 that has not been over-measured, the maintenance information 125 is further provided, as shown in step 42.

In an embodiment of the present invention, the computer device 11 can provide the maintenance information 125 according to the previous maintenance record, wherein the maintenance record includes the signal measurement position 172/174/176 of the previously measured card 17 to be tested and the corresponding amount. Test data 14. The maintenance information 125 includes maintenance records of the same or similar card 17 to be tested, such as measurement location information and its corresponding material. In various embodiments, the maintenance record may also include a circuit diagram of the card 17 to be tested and a predetermined location of the material 171/173/175, and the like.

The user can analyze the possible damage reason of the card 17 to be tested and the damaged parts 171/173/175 according to the maintenance information 125 provided by the computer device 11. For example, most of the cards 17 to be tested have replaced the A material. The test card 17 does not measure the corresponding signal measurement position of the A material component, and the user can regard the A material component as a possible damage location, and measure the signal corresponding to the A component. position. In addition, the maintenance information allows the user to check whether the card 17 to be tested has a line connection or a problem in which the position of the material is placed incorrectly. In other words, the user can measure the signal measurement position of the test card 17 without over-measurement and/or the corresponding material according to the maintenance information 125 provided by the computer device 11, and obtain the signal measurement position and/or The measurement data 14 of the corresponding material is as shown in step 43.

The computer device 11 can record the signal measurement position 172/174/176, the corresponding material 171/173/175 and/or the measurement data 14, for example, storing the above data in the storage unit 111, and establishing a new measurement. Location information 121, preset data 123, and/or measurement data 14. By updating the measurement location information 121, the preset data 123 and/or the measurement data 14, the data that can be provided by the computer device 11 can be further increased, so that the subsequent user can apply the new measurement location information 121 and preset. The data 123 and/or the measurement data 14 detects the board 17 to be tested, thereby improving the detection efficiency of the card 17 to be tested.

In summary, the present invention provides a test maintenance system and a test maintenance method for a card 17 to be tested. The user can perform the test and maintenance of the simple test card 17 through the measurement position information 121 provided by the computer device 11. . In addition, the user can also analyze the cause of the possible damage to the card 17 to be tested and the materials by using the related maintenance information 125 provided by the computer device 11. Further, all maintenance records can be further stored in the storage unit 111 of the computer device 11, for example, new measurement location information 121 and/or preset data 123 can be generated to provide subsequent maintenance use. With the accumulation of measurement records, the test maintenance system and test maintenance method described in the present invention can be improved, and the application range of the system and method can be improved, and everyone can use the system as long as they use the system. Can be repaired.

A connection as referred to in the present invention refers to a direct connection or an indirect connection between one or more objects or members, for example one or more intermediate connections may be present between one or more objects or members.

The words "may," and "changes" described in the system of the specification are not limitations of the invention. The technical terms used in the specification are mainly for the description of specific embodiments and are not intended to be limiting. The single quantifiers (such as one and the one) used in the specification may also be plural, unless explicitly stated in the contents of the specification. For example, a device referred to in the specification may include a combination of two or more devices, and one of the materials mentioned in the specification may include a mixture of a plurality of substances.

The above is only the preferred embodiment of the present invention, and is not intended to limit the scope of the present invention, that is, the variations, modifications, and modifications of the shapes, structures, features, and spirits described in the claims of the present invention. All should be included in the scope of the patent application of the present invention.

10‧‧‧Test maintenance system

11‧‧‧Computer equipment

111‧‧‧ storage unit

121‧‧‧Measurement location information

123‧‧‧Maintenance information

13‧‧‧Data Transfer Unit

14‧‧‧Measurement data

15‧‧‧Data Measurement Unit

17‧‧‧Test card

171‧‧‧Materials

172‧‧‧ Signal measurement position

173‧‧‧Materials

174‧‧‧ Signal measurement position

175‧‧‧Materials

176‧‧‧ Signal measurement position

19‧‧‧Test signal supply unit

Claims (16)

A test maintenance system includes: a data measurement unit that connects at least one signal measurement position of a card to be tested, and extracts at least one measurement data from a signal measurement position of the card to be tested; a data transmission unit, Connecting the data measuring unit; and a computer device connected to the data transmission unit, and including a storage unit, storing at least one preset data and at least one measurement location information, wherein the measurement location information includes the card to be tested The signal measuring position, and the computer device obtains the measurement data from the data measurement unit through the data transmission unit, and compares the measurement data with the corresponding preset data to generate a detection result. The test maintenance system of claim 1 further includes a test signal supply unit connected to the test card and providing a test signal to the test card. The test and repair system of claim 1, wherein the computer device finds the corresponding preset data and the measured position information in the storage unit according to the model of the card to be tested. The test maintenance system of claim 3, wherein the data measurement unit connects the corresponding measurement position of the signal on the card to be tested according to the measurement location information. The test maintenance system of claim 1, wherein the data measurement unit is an interface oscilloscope. The test maintenance system of claim 1, wherein the measurement data is a voltage value or a waveform diagram. The test maintenance system of claim 1, wherein the card to be tested comprises a plurality of material parts and a plurality of signal measurement positions, and the respective material parts respectively correspond to the at least one signal measurement position. The test maintenance system of claim 7, wherein the storage unit stores at least one maintenance information, the repair information including the measurement position information of the same or similar card to be tested, the corresponding material and the preset data. The test maintenance system of claim 8, wherein the maintenance information further includes a circuit diagram of the card to be tested and a location of the material. A test and maintenance method includes the following steps: providing at least one measurement position information of the card to be tested according to a model of the card to be tested; and performing at least one measurement position of the card to be tested according to the measurement position information Measuring, and taking at least one measurement data; and comparing the measurement data and at least one preset data, and generating a detection result. The test and repair method of claim 10, further comprising the step of: replacing at least one component of the card to be tested according to the detection result. The test and repair method of claim 11 further includes the following steps: testing whether the card to be tested is operating normally. The test and repair method of claim 12, wherein the card to be tested comprises a plurality of materials and a plurality of signal measurement locations, and the respective components respectively correspond to the at least one signal measurement location. The test and repair method of claim 13, further comprising the step of: determining whether the card to be tested has other signal measurement positions that are not over-measured. The test and repair method of claim 14, further comprising the steps of: providing one of the display card maintenance information, wherein the repair information includes the measured position information of the same or similar card to be tested, the corresponding material, and the Preset data. The test maintenance method of claim 15, wherein the maintenance information further includes a circuit diagram of the card to be tested and a location of the material.