TW201518532A - Holding arrangement for substrates and apparatus and method using the same - Google Patents

Holding arrangement for substrates and apparatus and method using the same Download PDF

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Publication number
TW201518532A
TW201518532A TW103126528A TW103126528A TW201518532A TW 201518532 A TW201518532 A TW 201518532A TW 103126528 A TW103126528 A TW 103126528A TW 103126528 A TW103126528 A TW 103126528A TW 201518532 A TW201518532 A TW 201518532A
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Taiwan
Prior art keywords
substrate
frame members
frame
support arrangement
opening
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TW103126528A
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Chinese (zh)
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Andre Bruning
Reiner Hinterschuster
Hans Georg Wolf
Thomas Werner Zilbauer
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Applied Materials Inc
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Publication of TW201518532A publication Critical patent/TW201518532A/en

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    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/458Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
    • C23C16/4582Rigid and flat substrates, e.g. plates or discs
    • C23C16/4583Rigid and flat substrates, e.g. plates or discs the substrate being supported substantially horizontally
    • C23C16/4585Devices at or outside the perimeter of the substrate support, e.g. clamping rings, shrouds
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/50Substrate holders
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/458Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
    • C23C16/4582Rigid and flat substrates, e.g. plates or discs
    • C23C16/4587Rigid and flat substrates, e.g. plates or discs the substrate being supported substantially vertically

Abstract

A holding arrangement (10) for holding a substrate (20) during vacuum layer deposition is provided. The holding arrangement (10) includes a frame (30) having two or more frame elements (31, 32, 33, 34), the frame elements (31, 32, 33, 34) forming an aperture opening, and elastic means (40) configured to provide a clamping force acting against portions of the substrate edges for clamping the substrate (20) at said substrate edges.

Description

用於基板之支承配置及應用其之設備及方法 Supporting arrangement for substrate and apparatus and method therefor

本發明之實施例是有關於一種用於在例如是層沉積之處理期間支承基板的支承配置,以及一種用於在所述處理期間支承基板的方法。本發明之實施例特別是有關於一種用於在真空層沉積期間支承基板的支承配置,以及一種用於在所述真空層沉積期間支承基板的方法。 Embodiments of the present invention are directed to a support arrangement for supporting a substrate during processing such as layer deposition, and a method for supporting a substrate during the process. Embodiments of the present invention are particularly directed to a support arrangement for supporting a substrate during deposition of a vacuum layer, and a method for supporting a substrate during deposition of the vacuum layer.

數種用於沉積材料於基板上之方法係已知。舉例來說,基板可藉由物理氣相沉積(physical vapor deposition,PVD)製程、化學氣相沉積(chemical vapor deposition,CVD)製程、電漿輔助化學氣相沉積(plasma enhanced chemical vapor deposition,PECVD)製程等來進行塗佈。一般來說,製程係在製程設備或製程腔體中執行,將進行塗佈之基板係位在製程設備或製程腔體中。沉積材料係提供至設備中。數種材料及其氧化物、氮化物或碳化物可用於沉積於基板上。再者,其他像是蝕刻、成型(structuring)、退火、或類似步驟之製程步驟可在製程腔體中處 理。 Several methods for depositing materials onto substrates are known. For example, the substrate can be subjected to a physical vapor deposition (PVD) process, a chemical vapor deposition (CVD) process, or a plasma enhanced chemical vapor deposition (PECVD) process. The process or the like is applied. Generally, the process is performed in a process equipment or process chamber, and the coated substrate is tied to the process equipment or process chamber. The deposited material is supplied to the device. Several materials and their oxides, nitrides or carbides can be used for deposition on a substrate. Furthermore, other process steps such as etching, structuring, annealing, or the like can be performed in the process chamber Reason.

塗佈材料可於數種應用中及數種技術領域中使用。舉例來說,在微電子領域中的一種應用,例如是製造半導體裝置。再者,用於顯示器之基板時常係藉由PVD製程塗佈。其他的應用包括絕緣面板、有機發光二極體(organic light emitting diode,OLED)面板、具有薄膜電晶體(TFT)之基板、彩色濾光片或類似物。 Coating materials can be used in several applications and in several technical fields. For example, one application in the field of microelectronics is, for example, the fabrication of semiconductor devices. Furthermore, the substrate used for the display is often coated by a PVD process. Other applications include insulating panels, organic light emitting diode (OLED) panels, substrates with thin film transistors (TFTs), color filters or the like.

一般來說,玻璃基板可在其處理期間支撐於載體上。載體係驅動玻璃或基板通過製程機器。載體一般係形成為一框架或一板而沿著基板之周圍支撐基板之一表面,或者在後者之情況中,以其本身來支撐表面。特別是,框狀載體可亦遮蔽玻璃基板,其中由框架圍繞之在載體中的開口係用於讓塗佈材料沉積於暴露之基板部分上,或者用於讓其他製程步驟作用在開口暴露之基板部分上。再者,支承配置係提供而用於在處理期間固定基板於框架且支承基板於適當的位置。 Generally, the glass substrate can be supported on the carrier during its processing. The carrier drives the glass or substrate through the process machine. The carrier is typically formed as a frame or a plate to support one surface of the substrate along the periphery of the substrate, or in the latter case, to support the surface by itself. In particular, the frame carrier can also shield the glass substrate, wherein the opening in the carrier surrounded by the frame is used to deposit the coating material on the exposed substrate portion, or to allow other processing steps to act on the substrate exposed by the opening. Partially. Furthermore, a support arrangement is provided for securing the substrate to the frame during processing and supporting the substrate in place.

於一些領域中,例如是在顯示觸控面板製造中使用PVD而用於手機應用顯示器(舉例為液晶顯示器),製造者趨向單片式玻璃基板(one glass substrate,OGS)方案:將塗佈之基板已經係最終之裝置尺寸(例如是手機尺寸),以取代塗佈較大之母玻璃且接著切割較大之母玻璃成最終之手機尺寸。 In some fields, such as the use of PVD in display touch panel manufacturing for mobile phone application displays (such as liquid crystal displays), manufacturers tend to one glass substrate (OGS) solution: coating The substrate has been the final device size (eg, cell phone size) instead of coating a larger mother glass and then cutting the larger mother glass into the final cell phone size.

可行之支承配置係藉由提供一支承力至基板之延伸表面來支承基板,也就是亦提供支承力至將塗佈之延伸表面來支 承基板。舉例來說,夾持件係接觸延伸表面以支承或夾持基板。因此,至少部分之上述需求無法滿足,特別是有關於OGS方案。 A viable support arrangement supports the substrate by providing a supporting force to the extended surface of the substrate, that is, providing a supporting force to support the extended surface of the coating The substrate is supported. For example, the gripping member contacts the extended surface to support or clamp the substrate. Therefore, at least some of the above requirements cannot be met, especially regarding the OGS program.

有鑑於上述,本發明之一目的係提供一支承配置,特別是用於在真空層沉積期間支承基板之支承配置,以克服此領域中之至少一些問題。 In view of the foregoing, it is an object of the present invention to provide a support arrangement, particularly for supporting a support substrate during deposition of a vacuum layer, to overcome at least some of the problems in the art.

有鑑於上述,根據獨立申請專利範圍第1項之一種用於在真空層沉積期間支承基板之支承配置,以及根據獨立申請專利範圍第15項之一種用於在真空層沉積期間支承基板之方法係提供。本發明之其他方面、優點、及特性係透過附屬申請專利範圍、說明、以及所附圖式更為清楚。 In view of the above, a support arrangement for supporting a substrate during vacuum layer deposition according to item 1 of the independent patent application, and a method for supporting a substrate during vacuum layer deposition according to item 15 of the independent patent application provide. Other aspects, advantages, and features of the invention will be apparent from the appended claims and claims.

根據一實施例,一種用於在真空層沉積期間支承一基板之支承配置包括一框架,具有二或多個框件,框件形成一開口;以及一彈性構件,配置以提供作用於基板邊緣之一夾持力,用於在所述之基板邊緣夾持基板。 According to an embodiment, a support arrangement for supporting a substrate during deposition of a vacuum layer includes a frame having two or more frame members, the frame member forming an opening, and an elastic member configured to provide an action on the edge of the substrate A clamping force for holding the substrate at the edge of the substrate.

根據另一實施例,一種用於在真空層沉積期間支承一基板之支承配置包括一框架,具有二或多個框件,框件形成一開口;以及一彈性構件,連接此二或多個框件。此二或多個框件係相對於彼此可移動的,且配置以改變開口之一尺寸。彈性構件係提供作用於此二或多個框件之一收縮力,用以於基板邊緣夾持基板。 According to another embodiment, a support arrangement for supporting a substrate during deposition of a vacuum layer includes a frame having two or more frame members, the frame member forming an opening, and an elastic member connecting the two or more frames Pieces. The two or more frames are movable relative to each other and are configured to change one of the dimensions of the opening. The elastic member provides a contracting force acting on one of the two or more frame members for holding the substrate at the edge of the substrate.

根據一實施例,一種用於沉積一層於一基板上之設 備包括一腔體,適用於層沉積於其中;如上所述之支承配置,位於腔體中;以及一沉積源,用於沉積材料以形成層。 According to an embodiment, a device for depositing a layer on a substrate A cavity is provided for applying a layer deposition therein; a support arrangement as described above, located in the cavity; and a deposition source for depositing a material to form a layer.

根據一實施例,一種用於在真空層沉積期間支承一基板之方法包括提供一框架,框架係形成一開口;定位基板於開口中;以及提供作用於基板邊緣之一夾持力,用於在所述之基板邊緣夾持基板。 According to an embodiment, a method for supporting a substrate during deposition of a vacuum layer includes providing a frame, the frame forming an opening; positioning the substrate in the opening; and providing a clamping force acting on the edge of the substrate for The substrate edge sandwiches the substrate.

根據另一實施例,一種用於在真空層沉積期間支承一基板之方法包括相對於彼此移動一框架之二或多個框件,以增大由所述之框件所形成之一開口的一尺寸;定位基板於開口中;以及釋放此二或多個框件,以於基板邊緣夾持基板。為了對本發明之上述及其他方面有更佳的瞭解,下文特舉較佳實施例,並配合所附圖式,作詳細說明如下: In accordance with another embodiment, a method for supporting a substrate during deposition of a vacuum layer includes moving two or more frames of a frame relative to each other to increase one of the openings formed by the frame member Dimensions; positioning the substrate in the opening; and releasing the two or more frame members to sandwich the substrate at the edge of the substrate. In order to better understand the above and other aspects of the present invention, the preferred embodiments are described below, and in conjunction with the drawings, the detailed description is as follows:

10‧‧‧支承配置 10‧‧‧Support configuration

11‧‧‧角度 11‧‧‧ angle

20‧‧‧基板 20‧‧‧Substrate

30‧‧‧框架 30‧‧‧Frame

31、32、33、34‧‧‧框件 31, 32, 33, 34‧‧‧ frame

35、36、37、38‧‧‧分離區域 35, 36, 37, 38‧‧‧ separate areas

39‧‧‧箭頭 39‧‧‧ arrow

40‧‧‧彈性構件 40‧‧‧Flexible components

41‧‧‧榫槽連接件 41‧‧‧榫口连接件

42‧‧‧間隙 42‧‧‧ gap

50‧‧‧固定板 50‧‧‧ fixed board

51‧‧‧貼附構件 51‧‧‧ Attached components

100‧‧‧方法 100‧‧‧ method

101、102、103‧‧‧流程步驟 101, 102, 103‧‧‧ process steps

600‧‧‧設備 600‧‧‧ equipment

612‧‧‧腔體 612‧‧‧ cavity

620‧‧‧基板傳輸裝置 620‧‧‧Substrate transfer device

630‧‧‧沉積源 630‧‧‧Sedimentary source

665‧‧‧線 665‧‧‧ line

為了可詳細地了解本發明上述之特點,簡要摘錄於上之本發明更特有的說明可參照實施例。所附之圖式係有關於本發明的實施例且係說明如下:第1圖繪示根據此處所述實施例之支承配置及具有提供於支承配置之開口中之基板的示意圖;第2圖繪示根據此處所述實施例之支承配置及具有提供於支承配置之開口中之基板係釋放的示意圖;第3圖繪示根據此處所述實施例之支承配置的詳細視圖;第4圖繪示根據此處所述實施例之另一支承配置及具有將定 位於所述支承配置之開口的基板的示意圖;第5圖繪示根據此處所述實施例之第4圖之支承配置及具有容置於開口且夾持的基板的示意圖;第6圖繪示根據此處所述實施例之支承配置的示意圖;第7圖繪示根據此處所述實施例之第6圖之支承配置的詳細視圖;第8圖繪示根據此處所述實施例之突出於基板表面的上方之框架的示意圖;第9圖繪示利用根據此處所述實施例之支承配置之用於沉積材料層於基板上之設備的示意圖;以及第10圖繪示根據此處所述實施例之用於在真空層沉積期間支承基板的方法的流程圖。 In order to understand the above-described features of the present invention in detail, a more detailed description of the present invention will be briefly described. The accompanying drawings are directed to the embodiments of the present invention and are described as follows: Figure 1 is a schematic view of a support arrangement according to embodiments described herein and a substrate having an opening provided in a support arrangement; A schematic view of a support arrangement according to embodiments described herein and a substrate release having openings provided in a support arrangement is illustrated; and FIG. 3 is a detailed view of a support arrangement in accordance with embodiments herein; FIG. Illustrating another support configuration according to embodiments described herein and having A schematic view of a substrate located in the opening of the support arrangement; FIG. 5 is a schematic view showing a support arrangement according to FIG. 4 of the embodiment described herein and having a substrate housed in the opening and clamped; FIG. 6 is a schematic view A schematic view of a support arrangement according to embodiments described herein; a seventh view showing a detailed view of the support arrangement according to the sixth embodiment of the embodiment described herein; and FIG. 8 is a view of the embodiment according to the embodiment described herein Schematic diagram of a frame above the surface of the substrate; FIG. 9 is a schematic view of an apparatus for depositing a layer of material on a substrate using a support arrangement according to embodiments described herein; and FIG. 10 is a diagram A flow chart of a method of supporting a substrate during vacuum layer deposition of the embodiments.

詳細的參照將以本發明之數種實施例來達成,實施例的一或多個例子係繪示在圖式中。在圖式之下述說明中,相同之參考編號係意指相同之元件。一般來說,僅有有關於各別實施例之不同之處係進行說明。各例子係藉由說明本發明的方式提供且不意味為本發明之一限制。再者,所說明或敘述而做為一實施例之部分之特性可用於其他實施例或與其他實施例結合,以取得再其他實施例。此意指本說明包括此些調整及變化。 A detailed reference will be made in the embodiments of the invention, and one or more examples of the embodiments are illustrated in the drawings. In the following description of the drawings, the same reference numerals are used to refer to the same elements. In general, only the differences between the various embodiments are described. The examples are provided by way of illustration of the invention and are not intended to be a limitation of the invention. Furthermore, the features illustrated or described as part of one embodiment can be used in other embodiments or in combination with other embodiments to achieve further embodiments. This means that the description includes such adjustments and changes.

根據可與此處所述其他實施例結合之典型實施例,基板之厚度可為從0.1至0.8mm,且支承配置以及特別是支承裝置可適用於此種基板之厚度。然而,基板之厚度係約0.9mm或 以下係特別是有利的,基板之厚度例如是0.5mm或0.3mm,且支承配置以及特別是支承裝置係適用於此種基板之厚度。 According to an exemplary embodiment that can be combined with other embodiments described herein, the thickness of the substrate can range from 0.1 to 0.8 mm, and the support arrangement and in particular the support means can be adapted to the thickness of such a substrate. However, the thickness of the substrate is about 0.9 mm or It is particularly advantageous if the thickness of the substrate is, for example, 0.5 mm or 0.3 mm, and the support arrangement and in particular the support means are suitable for the thickness of such a substrate.

根據一些實施例,大面積基板或支撐一或多個基板之載體可具有至少0.174m2之尺寸,支撐一或多個基板之載體也就是大面積載體。一般來說,載體之尺寸可為約1.4m2至約8m2,更特別是約2m2至約9m2或甚至高達12m2。一般來說,支撐基板的矩形區域係為具有用於此處所述之大面積基板之尺寸的載體,基板係提供予根據此處所述實施例之支承配置、設備、及方法。舉例來說,可對應於單一大面積基板之一區域的大面積載體可為第5代、第7.5代、第8.5代、或甚至第10代,第5代對應於約1.4m2之基板(1.1m x 1.3m),第7.5代對應於約4.29m2之基板(1.95m x 2.2m),第8.5代對應於約5.7m2之基板(2.2m x 2.5m),第10代對應於約8.7m2之基板(2.85m×3.05m)。甚至是更高代可以類似之方式應用,例如是第11代第12代以及對應之基板面積。 According to some embodiments, the large area substrate or the carrier supporting the one or more substrates may have a size of at least 0.174 m 2 , and the carrier supporting the one or more substrates is also a large area carrier. Generally, the size of the carrier can range from about 1.4 m 2 to about 8 m 2 , more specifically from about 2 m 2 to about 9 m 2 or even up to 12 m 2 . In general, the rectangular region of the support substrate is a carrier having dimensions for the large area substrate described herein, the substrate being provided to a support arrangement, apparatus, and method in accordance with embodiments described herein. For example, a large-area carrier that can correspond to a region of a single large-area substrate can be 5th generation, 7.5th generation, 8.5th generation, or even 10th generation, and the 5th generation corresponds to a substrate of about 1.4m 2 ( 1.1mx 1.3m), 7.5G corresponding to about 4.29m 2 of the substrate (1.95mx 2.2m), corresponding to about 8.5 Generation of 5.7m 2 substrate (2.2mx 2.5m), the 10th generation corresponding to about 8.7m 2 substrate (2.85m × 3.05m). Even higher generations can be applied in a similar manner, such as the 11th generation 12th generation and the corresponding substrate area.

一般來說,基板可以任何適合用於材料沉積之材料製成。舉例來說,基板可由選自群組之一材料製成,此群組係由玻璃(例如是鈉鈣玻璃(soda-lime glass)、硼矽玻璃(borosilicate glass)等)、金屬、聚合物、陶瓷、複合材料、碳纖維材料或任何其他材料或可藉由沉積製程塗佈之材料之組合所組成。 In general, the substrate can be made of any material suitable for deposition of materials. For example, the substrate may be made of a material selected from the group consisting of glass (eg, soda-lime glass, borosilicate glass, etc.), metal, polymer, A combination of ceramic, composite, carbon fiber material or any other material or material that can be coated by a deposition process.

第1圖繪示根據此處所述實施例之支承配置10及具有提供於支承配置10之開口中之基板20的示意圖。 1 is a schematic view of a support arrangement 10 and a substrate 20 having openings provided in a support arrangement 10 in accordance with embodiments described herein.

根據一些實施例,用於在真空層沉積期間支承基板20之支承配置10包括載體或框架30及彈性構件。框架30具有兩個或多個框件31、32、33及34,框件31、32、33及34係形成一開口。彈性構件配置以提供作用於基板邊緣的夾持力,用於在所述之基板邊緣夾持基板20。在繪示於第1圖中之例子中,框架具有四個框件31、32、33及34。 According to some embodiments, the support arrangement 10 for supporting the substrate 20 during vacuum layer deposition includes a carrier or frame 30 and an elastic member. The frame 30 has two or more frame members 31, 32, 33 and 34, and the frame members 31, 32, 33 and 34 form an opening. The resilient member is configured to provide a clamping force that acts on the edge of the substrate for holding the substrate 20 at the edge of the substrate. In the example illustrated in Figure 1, the frame has four frame members 31, 32, 33 and 34.

就OGS方案來說,用於塗佈膜於基板上之PVD製程(例如是磁控陰極濺渡(magnetron cathode sputtering)製程)需在膜塗佈沒有任何來自夾持基板於載體中之支承配置的任何擾動或干擾的情況下,從邊(rim)至邊應用在完整之基板表面上。特別是在OGS方案中,下述數個方面必須留意:支承配置不能覆蓋在基板之前方上的基板邊區域(也就是沒有邊緣排除)。基板前側應從邊至邊進行塗佈。支承配置不能突出於基板邊高度之上方,支承配置突出於基板邊高度之上方會阻礙表面塗佈。支承配置應避免基板後側有任何(可見之)塗佈殘留(也就是說,沒有後側塗佈),以及支承配置應避免基板邊有任何(可見之)塗佈殘留(也就是說,沒有邊塗佈)。 In the case of the OGS scheme, the PVD process for coating the film on the substrate (for example, a magnetron cathode sputtering process) requires film coating without any support configuration from the holding substrate in the carrier. In the case of any disturbance or interference, it is applied from the rim to the edge on the entire substrate surface. Especially in the OGS scheme, the following aspects must be noted: the support arrangement cannot cover the edge area of the substrate on the front side of the substrate (that is, there is no edge exclusion). The front side of the substrate should be coated from side to side. The support arrangement does not protrude above the height of the substrate side, and the support arrangement protrudes above the height of the substrate side to hinder surface coating. The support arrangement should avoid any (visible) coating residue on the back side of the substrate (that is, no back side coating), and the support arrangement should avoid any (visible) coating residue on the substrate side (ie, no Side coating).

此處使用之名稱「基板邊緣(substrate edge)」或名稱「數個基板邊緣」係意指基板之側向表面,也就是沿著基板20之厚度方向延伸的表面。舉例來說,邊緣可為連接基板前側於基板後側的基板之表面。除了側向表面之外,基板20具有兩個延伸表面。基板20之其中一個延伸表面可為將處理之表面,且可 意指為基板20之前側,處理舉例為塗佈。相對於將處理之延伸表面的另一延伸表面可意指為基板20之後側。然而,根據一些實施例,兩個延伸表面也可皆進行處理。因此,可理解的是,基板具有四個側向表面。 The term "substrate edge" or "several substrate edge" as used herein means the lateral surface of the substrate, that is, the surface extending along the thickness direction of the substrate 20. For example, the edge may be the surface of the substrate connecting the front side of the substrate to the back side of the substrate. In addition to the lateral surfaces, the substrate 20 has two extended surfaces. One of the extended surfaces of the substrate 20 may be a surface to be processed, and It means the front side of the substrate 20, and the treatment is exemplified by coating. Another extended surface relative to the extended surface to be treated may be referred to as the back side of the substrate 20. However, according to some embodiments, both extended surfaces may also be processed. Thus, it will be appreciated that the substrate has four lateral surfaces.

此處所使用之名稱「彈性構件(elastic means)」可意指為單數或複數,也就是說,一個彈性構件或數個彈性構件。此特別決定於特定實施例,其中在一些實施例中係提供一個彈性構件,且於一些實施例中係提供數個彈性構件。 The term "elastic means" as used herein may mean singular or plural, that is, an elastic member or a plurality of elastic members. This is particularly determined by the particular embodiment in which one elastic member is provided in some embodiments and several elastic members are provided in some embodiments.

根據可與此處所述其他實施例結合之一些實施例,開口係配置以容置(accommodate)或容納(house)基板20。根據一些實施例,此兩個或多個框件31、32、33及34係相對於彼此可移動的,且係配置以改變開口之尺寸。此係具有特別的優點,基板20可輕易地裝入框架30中且從框架30卸除。再者,基板20、框架30及在例如是塗佈期間框架30可能固定之固定板(見例如是第4及5圖)之熱延展可進行補償。 According to some embodiments, which may be combined with other embodiments described herein, the opening system is configured to accommodate or house the substrate 20. According to some embodiments, the two or more frame members 31, 32, 33, and 34 are movable relative to each other and are configured to change the size of the opening. This has the particular advantage that the substrate 20 can be easily loaded into and removed from the frame 30. Furthermore, the substrate 20, the frame 30, and the thermal extension of the mounting plate (see, for example, Figures 4 and 5), which may be fixed, for example, during coating, may be compensated for.

根據一些實施例,當基板20係裝入框架30中時,兩個或多個框件31、32、33及34係移動以增加或放大開口之尺寸。一旦基板20係定位於所述開口中時,兩個或多個框件31、32、33及34係移動以再度縮減開口之尺寸。因此,藉由提供作用於基板邊緣的夾持力來於所述之基板邊緣夾持基板20,基板20係夾持於開口中。根據一些實施例,彈性構件係致使兩個或多個框件31、32、33及34往回移動,以縮減開口之尺寸。因此, 力係作用於基板邊緣,也就是作用在本質上平行於延伸表面之部分的側向表面,延伸表面例如是前側或後側。 According to some embodiments, when the substrate 20 is loaded into the frame 30, the two or more frame members 31, 32, 33, and 34 are moved to increase or enlarge the size of the opening. Once the substrate 20 is positioned in the opening, the two or more frame members 31, 32, 33, and 34 are moved to again reduce the size of the opening. Therefore, the substrate 20 is held at the edge of the substrate by providing a clamping force acting on the edge of the substrate, and the substrate 20 is held in the opening. According to some embodiments, the resilient member causes the two or more frame members 31, 32, 33, and 34 to move back to reduce the size of the opening. therefore, The force acts on the edge of the substrate, that is, on the lateral surface that is substantially parallel to the portion of the extended surface, such as the front or back side.

當基板20係將從框架30卸除時,兩個或多個框件31、32、33及34可移動,以增加開口之尺寸且釋放作用於基板邊緣的夾持力。接著,基板20可自開口移除。 When the substrate 20 is unloaded from the frame 30, the two or more frame members 31, 32, 33 and 34 are movable to increase the size of the opening and release the clamping force acting on the edge of the substrate. Next, the substrate 20 can be removed from the opening.

根據可與此處所述其他實施例結合之一些實施例,框架30不覆蓋將處理之延伸表面的任何部分。也就是說,框架30不朝向將處理之延伸表面延伸而鄰近基板周圍。此讓完整之延伸表面進行處理。再者,例如是塗佈品質係不被框架30阻礙或降低。 According to some embodiments, which may be combined with other embodiments described herein, the frame 30 does not cover any portion of the extended surface to be treated. That is, the frame 30 does not extend toward the extended surface to be treated adjacent to the periphery of the substrate. This allows the complete extended surface to be processed. Further, for example, the coating quality is not hindered or lowered by the frame 30.

根據一些實施例,兩個或多個框件31、32、33及34至少部分地覆蓋基板邊緣。以一例子來說,兩個或多個框件31、32、33及34完全地覆蓋基板邊緣,以避免於基板邊緣之任何塗佈,也就是說,基板邊緣或邊係沒有進行塗佈,且特別是沒有可見的基板邊緣或邊之塗佈。此特別是在液晶顯示器(LCD)之製造中有利,其中移除在基板邊緣上任何不需要之塗佈殘留之額外製程步驟可避免,於最終之產品(例如是手機)可看見在基板邊緣上之塗佈殘留。此係因為在一些情況中,由於設計之考量,顯示器係黏附於手機殼體上而可看見小的顯示器之邊。 According to some embodiments, the two or more frame members 31, 32, 33 and 34 at least partially cover the edge of the substrate. By way of example, two or more of the frame members 31, 32, 33, and 34 completely cover the edge of the substrate to avoid any coating of the edge of the substrate, that is, the edge or edge of the substrate is not coated. And in particular no coating of the edges or edges of the substrate. This is particularly advantageous in the manufacture of liquid crystal displays (LCDs), where an additional process step of removing any unwanted coating residue on the edge of the substrate can be avoided, and the final product (eg, a cell phone) can be seen on the edge of the substrate. The coating remains. This is because in some cases, due to design considerations, the display is attached to the phone housing and the side of the small display is visible.

根據可與此處所述其他實施例結合之一些實施例,兩個或多個框件31、32、33及34係配置而以基板20之一表面係對齊所述之兩個或多個框件31、32、33及34之一表面的方式 於基板邊緣夾持基板20。在沒有任何框件31、32、33及34突出於將處理之表面的上方之情況下,也就是框件31、32、33及34沒有突出於邊緣或邊高度的上方之情況下,塗佈品質係不因框架30或框件31、32、33及34而受到阻礙或降低。根據一些其他實施例,框件31、32、33及34之至少一者之一部分係突出於基板表面之上方。此方面係繪示於第8圖中且隨後說明。 According to some embodiments, which may be combined with other embodiments described herein, two or more of the frame members 31, 32, 33 and 34 are configured to align one or more of the frames with one surface of the substrate 20 Way of surface of one of pieces 31, 32, 33 and 34 The substrate 20 is sandwiched at the edge of the substrate. In the case where no frame members 31, 32, 33 and 34 protrude above the surface to be treated, that is, the frame members 31, 32, 33 and 34 do not protrude above the edge or edge height, coating The quality is not hindered or reduced by the frame 30 or the frames 31, 32, 33 and 34. According to some other embodiments, at least one of the frame members 31, 32, 33, and 34 protrudes above the surface of the substrate. This aspect is illustrated in Figure 8 and is described later.

根據可與此處所述其他實施例結合之一些實施例,兩個或多個框件31、32、33及34係接觸基板邊緣,以提供作用於所述基板邊緣之夾持力。做為一例子來說,兩個或多個框件31、32、33及34接觸基板邊緣,以部分地或完全地覆蓋基板邊緣,也就是基板之側向表面,其中側向表面之一尺寸係對應於基板之厚度,用於避免基板邊緣之任何塗佈,如上所述。 According to some embodiments, which may be combined with other embodiments described herein, two or more of the frame members 31, 32, 33, and 34 are in contact with the edge of the substrate to provide a clamping force that acts on the edge of the substrate. As an example, two or more of the frame members 31, 32, 33 and 34 contact the edge of the substrate to partially or completely cover the edge of the substrate, that is, the lateral surface of the substrate, wherein one of the lateral surfaces is sized Corresponding to the thickness of the substrate, to avoid any coating of the edge of the substrate, as described above.

根據可與此處所述其他實施例結合之一些實施例,框架30具有配置以環繞、裝入(encapsulate)或圍繞基板20的兩個第一側區段(也就是框件31及33)以及兩個第二側區段(也就是框件32及34),兩個第一側區段例如是垂直區段,兩個第二側區段例如是水平區段。名稱水平及垂直區段係意指用於垂直方向之基板之沉積裝置之配置。於此一配置中,基板20之延伸表面係實質上平行於重力之方向。 According to some embodiments, which may be combined with other embodiments described herein, the frame 30 has two first side sections (ie, frame members 31 and 33) configured to encircle, enclose, or surround the substrate 20, and Two second side sections (i.e., frame members 32 and 34), the two first side sections are, for example, vertical sections, and the two second side sections are, for example, horizontal sections. The name horizontal and vertical sections means the configuration of the deposition apparatus for the substrate in the vertical direction. In this configuration, the extended surface of the substrate 20 is substantially parallel to the direction of gravity.

根據可與此處所述其他實施例結合之一些實施例,框架30係為實質上矩形之形狀。 According to some embodiments, which may be combined with other embodiments described herein, the frame 30 is substantially rectangular in shape.

根據可與此處所述其他實施例結合之一些實施例, 彈性構件係配置以提供作用於兩個或多個框件31、32、33及34之收縮力,用於提供夾持力。做為一例子來說,彈性構件可配置以拉動兩個或多個框件31、32、33及34朝向彼此。藉此,基板20可夾持且支承於開口中。 According to some embodiments that may be combined with other embodiments described herein, The resilient member is configured to provide a contracting force acting on the two or more frame members 31, 32, 33, and 34 for providing a clamping force. As an example, the resilient member can be configured to pull the two or more frame members 31, 32, 33, and 34 toward each other. Thereby, the substrate 20 can be clamped and supported in the opening.

根據可與此處所述其他實施例結合之一些實施例,兩個或多個框件31、32、33、及34係藉由彈性構件連接。藉此,特別是收縮力係可提供而作用於兩個或多個框件31、32、33、及34。根據一些實施例,兩個或多個框件31、32、33及34之每兩者係藉由彈性構件之對應一者連接。根據一些其他實施例,兩個或多個框件31、32、33及34之多於二者係藉由彈性構件之對應一者連接。根據一些其他實施例,兩個或多個框件31、32、33及34之全部係藉由一彈性構件連接。 According to some embodiments, which may be combined with other embodiments described herein, two or more of the frame members 31, 32, 33, and 34 are connected by an elastic member. Thereby, in particular, a contraction force can be provided to act on the two or more frame members 31, 32, 33, and 34. According to some embodiments, each of the two or more frame members 31, 32, 33, and 34 is connected by a corresponding one of the resilient members. According to some other embodiments, more than two of the two or more frame members 31, 32, 33, and 34 are connected by a corresponding one of the resilient members. According to some other embodiments, all of the two or more frame members 31, 32, 33 and 34 are connected by an elastic member.

根據可與此處所述其他實施例結合之一些實施例,彈性構件40包括一或多個彈簧。於上述例子中,根據一些實施例,兩個或多個框件31、32、33及34之每兩者係藉由具有一或多個彈簧之彈性構件之對應一者連接。根據一些其他實施例,兩個或多個框件31、32、33及34之多於二者係藉由具有一或多個彈簧之彈性構件之對應一者連接。根據一些其他實施例,兩個或多個框件31、32、33及34之全部係藉由具有一或多個彈簧之一彈性構件連接。 According to some embodiments, which may be combined with other embodiments described herein, the resilient member 40 includes one or more springs. In the above examples, in accordance with some embodiments, each of the two or more frame members 31, 32, 33, and 34 is coupled by a corresponding one of the resilient members having one or more springs. According to some other embodiments, more than two of the two or more frame members 31, 32, 33, and 34 are connected by a corresponding one of the resilient members having one or more springs. According to some other embodiments, all of the two or more frame members 31, 32, 33 and 34 are connected by an elastic member having one or more springs.

根據可與此處所述其他實施例結合之一些實施例,彈性構件包括一或多個彈性帶,例如是橡皮筋。再次參照上述之 例子,根據一些實施例,兩個或多個框件31、32、33及34之每兩者係藉由具有一或多個彈性帶之彈性構件之對應一者連接。根據一些其他實施例,兩個或多個框件31、32、33及34之多於二者係藉由具有一或多個彈性帶之彈性構件之對應一者連接。根據一些其他實施例,兩個或多個框件31、32、33及34之全部係藉由具有一或多個彈性帶之一彈性構件連接。 According to some embodiments, which may be combined with other embodiments described herein, the resilient member comprises one or more elastic bands, such as rubber bands. Referring again to the above By way of example, in accordance with some embodiments, each of the two or more frame members 31, 32, 33, and 34 are joined by a corresponding one of the resilient members having one or more elastic bands. According to some other embodiments, more than two of the two or more frame members 31, 32, 33, and 34 are joined by a corresponding one of the resilient members having one or more elastic bands. According to some other embodiments, all of the two or more frame members 31, 32, 33, and 34 are joined by an elastic member having one or more elastic bands.

做為一例子來說,彈性帶可配置以完全地環繞框架30,以連接框架30之全部框件31、32、33及34。在後者之情況中,彈性帶可形成封閉環(closed loop)。根據一些實施例,可使用不同彈性構件之任何結合,例如是彈簧及彈性帶。 As an example, the elastic band can be configured to completely surround the frame 30 to join all of the frame members 31, 32, 33, and 34 of the frame 30. In the latter case, the elastic band can form a closed loop. According to some embodiments, any combination of different elastic members may be used, such as springs and elastic bands.

根據可與此處所述其他實施例結合之一些實施例,彈性構件係藉由兩個或多個框件31、32、33、及34覆蓋。根據可與此處所述其他實施例結合之一些實施例,彈性構件係併入於兩個或多個框件31、32、33、及34中。彈性構件可併入於框架主體中或由框架覆蓋,以保護彈性構件免於意外之塗佈及隨後之粒子剝落。 According to some embodiments, which may be combined with other embodiments described herein, the resilient member is covered by two or more frame members 31, 32, 33, and 34. According to some embodiments, which may be combined with other embodiments described herein, the resilient member is incorporated into two or more of the frame members 31, 32, 33, and 34. The elastic member may be incorporated into or covered by the frame body to protect the elastic member from accidental application and subsequent particle peeling.

根據可與此處所述其他實施例結合之一些實施例,兩個或多個框件31、32、33、及34係以金屬或塑膠製成,或者兩個或多個框件31、32、33、及34包括金屬或塑膠。做為一例子來說,兩個或多個框件31、32、33、及34可以任何例如是金屬(例如是鋁、不銹鋼)之機械加工材料(machinable material)或真空可處理塑膠(vacuum capable plastic)(例如是聚醚醚酮(PEEK)) 製成。 According to some embodiments, which may be combined with other embodiments described herein, the two or more frame members 31, 32, 33, and 34 are made of metal or plastic, or two or more frame members 31, 32. , 33, and 34 include metal or plastic. As an example, the two or more frame members 31, 32, 33, and 34 may be any machinable material or vacuum processable plastic such as aluminum (for example, aluminum or stainless steel). Plastic) (for example, polyetheretherketone (PEEK)) production.

根據可與此處所述其他實施例結合之一些實施例,兩個或多個框件31、32、33、及34之一表面之至少一部分係粗糙的。因此,意外之塗佈及不需要之粒子係黏附於所述之粗糙的表面,藉此避免已塗佈之膜品質下降。 According to some embodiments, which may be combined with other embodiments described herein, at least a portion of one or more of the surfaces of the two or more frame members 31, 32, 33, and 34 are rough. Thus, unexpected coatings and unwanted particles adhere to the roughened surface, thereby avoiding a drop in the quality of the applied film.

第2圖繪示根據此處所述實施例之支承配置10及具有提供於支承配置10之開口中的基板20係釋放之示意圖。 2 is a schematic illustration of the support arrangement 10 and the release of the substrate 20 provided in the opening of the support arrangement 10 in accordance with embodiments described herein.

根據一些實施例,當基板20載入框架30中時,兩個或多個框件31、32、33及34可移動,以增加開口之尺寸。一旦基板20係定位於所述之開口中,兩個或多個框件31、32、33及34係往回移動,以再度減少開口之尺寸。藉此,作用於基板邊緣之夾持力係提供,用以於所述基板邊緣夾持基板20。根據一些實施例,彈性構件係致使兩個或多個框件31、32、33及34往回移動,以減少開口之尺寸且夾持基板20。 According to some embodiments, when the substrate 20 is loaded into the frame 30, the two or more frame members 31, 32, 33, and 34 are movable to increase the size of the opening. Once the substrate 20 is positioned in the opening, the two or more frame members 31, 32, 33, and 34 are moved back to again reduce the size of the opening. Thereby, a clamping force acting on the edge of the substrate is provided for holding the substrate 20 at the edge of the substrate. According to some embodiments, the resilient member causes the two or more frame members 31, 32, 33, and 34 to move back to reduce the size of the opening and clamp the substrate 20.

當基板20係從如第2圖中所示之框架30卸除時,兩個或多個框件31、32、33及34可移動以增加開口之尺寸。移動係以標註參考編號39之箭頭表示出來。兩個或多個框件31、32、33及34係在標註有參考編號35、36、37及38之分離區域中彼此分開。雖然四個框件及四個對應之分離區域35、36、37及38係繪示於第2圖中,此處所述實施例係不以此為限。任何數量之框件及對應之分離區域可存在,例如是兩個框件及兩個分離區域。在第2圖之例子中,分離區域35、36、37及38係為框 架30之角落區域。 When the substrate 20 is unloaded from the frame 30 as shown in Fig. 2, the two or more frame members 31, 32, 33 and 34 are movable to increase the size of the opening. The movement is indicated by an arrow labeled with reference numeral 39. Two or more of the frame members 31, 32, 33 and 34 are separated from each other in a separate area labeled with reference numerals 35, 36, 37 and 38. Although the four frame members and the four corresponding separation regions 35, 36, 37, and 38 are shown in FIG. 2, the embodiments described herein are not limited thereto. Any number of frame members and corresponding separate regions may be present, such as two frame members and two separate regions. In the example of Fig. 2, the separation regions 35, 36, 37, and 38 are frames. The corner area of the shelf 30.

藉由移動兩個或多個框件31、32、33及34以分離所述之兩個或多個框件31、32、33及34,開口之尺寸係增加且作用於基板邊緣之夾持力係因而釋放。接著,基板20可從開口移除。 By moving the two or more frame members 31, 32, 33 and 34 to separate the two or more frame members 31, 32, 33 and 34, the size of the opening is increased and acts on the edge of the substrate. The force is thus released. Next, the substrate 20 can be removed from the opening.

第3圖繪示根據此處所述實施例之繪示於第2圖中之支承配置之詳細視圖。第3圖繪示支承配置於開啟位置中,其中基板20係不再夾持,且特別是不再藉由框件34夾持。 Figure 3 is a detailed view of the support arrangement shown in Figure 2 in accordance with the embodiments described herein. Figure 3 illustrates the support being disposed in the open position wherein the substrate 20 is no longer clamped and in particular is no longer held by the frame member 34.

如第3圖中所示,根據可與此處所述其他實施例結合之一些實施例,兩個或多個框件31、32、33、及34可更藉由榫槽連接件(tongue and groove connections)、暗榫(dowels)及/或槽式接頭(slot joints)(以參考編號41標註)連接。做為一例子來說,兩個或多個框件31、32、33、及34可藉由所述之榫槽連接件41、暗榫及/或槽式接頭彼此對齊。 As shown in FIG. 3, two or more of the frame members 31, 32, 33, and 34 may be further supported by a tongue and groove joint according to some embodiments that may be combined with other embodiments described herein. Groove connections), dowels and/or slot joints (referenced with reference numeral 41) are connected. As an example, two or more of the frame members 31, 32, 33, and 34 may be aligned with one another by the tongue and groove connectors 41, the shackles, and/or the slotted joints.

在繪示於第3圖中之例子中,彈性構件40係彈性帶,例如是橡皮筋。彈性帶可提供以僅接觸兩個框件33及34,或提供以完全地環繞框架,以連接框架之全部框件。在後者之情況中,彈性帶可為封閉環(closed loop)。 In the example shown in Fig. 3, the elastic member 40 is an elastic band such as a rubber band. The elastic band can be provided to contact only the two frame members 33 and 34, or to completely surround the frame to join all of the frame members. In the latter case, the elastic band can be a closed loop.

根據可與此處所述其他實施例結合之一些實施例,甚至當基板20係夾持於開口中時,類似於第3圖中之在兩個或多個框件31、32、33及34之間的間隙可維持。間隙之存在與間隙之尺寸係決定於開口之最小尺寸、基板20之尺寸、及熱條件 之至少一者。後者之情況包括基板20、框架30、及框架可固定之固定板(見例如是第4及5圖,固定板係以參考編號50標註)的熱延展。根據一些實施例,間隙係夠小,以不妨礙基板塗佈品質。 According to some embodiments, which may be combined with other embodiments described herein, even when the substrate 20 is clamped in the opening, similar to the two or more frame members 31, 32, 33 and 34 in FIG. The gap between them can be maintained. The existence of the gap and the size of the gap are determined by the minimum size of the opening, the size of the substrate 20, and the thermal conditions. At least one of them. The latter case includes a thermal extension of the substrate 20, the frame 30, and the fixed plate to which the frame can be fixed (see, for example, Figures 4 and 5, the fixed plate is indicated by reference numeral 50). According to some embodiments, the gap is small enough to not interfere with substrate coating quality.

第4圖繪示根據此處所述實施例之另一支承配置10及基板20係定位於所述之支承配置10的開口中之示意圖。 FIG. 4 is a schematic view showing another support arrangement 10 and a substrate 20 positioned in the opening of the support arrangement 10 according to the embodiment described herein.

根據可與此處所述其他實施例結合之一些實施例,框架30係固定於固定板50上。固定板50可配置以貼附於例如是沉積腔體之基板傳輸裝置,如同第9圖中之例子所示。於此,固定板50可具有貼附構件(attachment means)51,例如是用於固定元件插入的孔,固定元件例如是螺絲。根據一些實施例,框架30之框件31、32之至少一者係以相對於固定板50可移動之方式提供,以讓所述之框件31、32之至少一者移動以改變開口之尺寸,開口係用以裝入及/或卸除基板20。 The frame 30 is secured to the fixed plate 50 in accordance with some embodiments that may be combined with other embodiments described herein. The fixing plate 50 can be configured to be attached to a substrate transfer device such as a deposition chamber as shown in the example of Fig. 9. Here, the fixing plate 50 may have an attachment means 51 such as a hole for inserting a fixing member such as a screw. According to some embodiments, at least one of the frame members 31, 32 of the frame 30 is provided movably relative to the fixed plate 50 to move at least one of the frame members 31, 32 to change the size of the opening. The opening is used to load and/or remove the substrate 20.

繪示於第4圖中之框架30具有實質上矩形之形狀。根據一些實施例,彈性構件係提供於所述之框架30之角落區域中。根據一些實施例,彈性構件係連接兩個或多個框件31、32。於第4圖之例子中,兩個框件31及32係提供。在所述之框件31、32之間的間隙係以相對於框件31、32之延伸大約45°之一角度為方向。然而,繪示於第4圖中之框架30可具有任何其他配置,例如是此處所揭露之實施例之任何其他配置。 The frame 30 illustrated in Figure 4 has a substantially rectangular shape. According to some embodiments, an elastic member is provided in a corner region of the frame 30. According to some embodiments, the resilient member connects the two or more frame members 31,32. In the example of Fig. 4, two frame members 31 and 32 are provided. The gap between the frame members 31, 32 is oriented at an angle of about 45 with respect to the extension of the frame members 31, 32. However, the frame 30 illustrated in FIG. 4 can have any other configuration, such as any other configuration of the embodiments disclosed herein.

第5圖繪示根據此處所述實施例之第4圖之支承配 置具有夾持之基板的示意圖。基板20係定位於框架30之開口中且係於基板邊緣進行夾持,因而穩固地支承於所述之開口中。如第5圖中所示,框件係提供推力於基板邊緣,也就是基板之側向表面。藉此,特別是前側係沒有被夾持件所覆蓋,或被另一夾持構件所覆蓋,且基板之整個前側可進行塗佈。 Figure 5 illustrates the support of Figure 4 in accordance with the embodiments described herein. A schematic view of a substrate having a clamp. The substrate 20 is positioned in the opening of the frame 30 and is clamped at the edge of the substrate, thereby being stably supported in the opening. As shown in Figure 5, the frame provides thrust to the edge of the substrate, i.e., the lateral surface of the substrate. Thereby, in particular, the front side is not covered by the holding member or covered by the other holding member, and the entire front side of the substrate can be coated.

根據可與此處所述其他實施例結合之一些實施例,在框件之間的間隙可能係例外之情況中,全部邊緣,也就是基板之所有側向表面係由框件所覆蓋,以避免邊緣之塗佈,邊緣也就是側向表面。然而,在邊緣之塗佈可能可接受之情況中,僅有部分之邊緣,也就是部分之基板之側向表面之兩者或多者可能係藉由框件接觸,且提供作用於基板邊緣之夾持力。 According to some embodiments, which may be combined with other embodiments described herein, in the case where the gap between the frame members may be exceptional, all edges, that is, all lateral surfaces of the substrate are covered by the frame member to avoid The coating of the edges, the edges are also the lateral surfaces. However, in the case where the coating of the edge may be acceptable, only a portion of the edges, that is, some or more of the lateral surfaces of the portion of the substrate may be contacted by the frame member and provided to act on the edge of the substrate. Holding force.

第6圖繪示類似於第4及5圖中之支承配置的支承配置的示意圖,且第7圖繪示第6圖之支承配置之詳細視圖。 Figure 6 is a schematic view showing a support arrangement similar to the support arrangement of Figures 4 and 5, and Figure 7 is a detailed view of the support arrangement of Figure 6.

第6及7圖繪示支承配置及特別是框架30在開啟狀態中之一情況的示意圖。在框件31及32之間的間隙42係以參考編號42標註。在第6及7圖之例子中,在框件31及32之間的間隙42係以相對於兩個或多個框件31、32之延伸大約45°之一角度為方向。在第6及7圖中所繪示之例子中,框架具有兩個框件31及32。然而,繪示於第6及7圖中之框架30可具有任何其他配置,例如是此處所揭露之任何其他實施例之任何其他配置。 Figures 6 and 7 show schematic views of the support arrangement and in particular one of the frames 30 in the open state. The gap 42 between the frame members 31 and 32 is indicated by reference numeral 42. In the examples of Figures 6 and 7, the gap 42 between the frame members 31 and 32 is oriented at an angle of about 45° with respect to the extension of the two or more frame members 31,32. In the examples illustrated in Figures 6 and 7, the frame has two frame members 31 and 32. However, the frame 30 illustrated in Figures 6 and 7 can have any other configuration, such as any other configuration of any of the other embodiments disclosed herein.

根據可與此處所述其他實施例結合之一些實施例, 類似於繪示在第6及7圖中之間隙42的一間隙可甚至在基板係夾持時維持於框件31及32之間。於夾持狀態中存在之所述間隙以及間隙42之尺寸可決定於開口之最小尺寸、基板之尺寸、以及熱條件之其中一者。後者之情況包括基板、框架30、及框架30可固定之固定板的熱延展。根據一些實施例,間隙係夠小,以不妨礙基板塗佈品質。 According to some embodiments that may be combined with other embodiments described herein, A gap similar to that shown in the gaps 42 of Figures 6 and 7 can be maintained between the frame members 31 and 32 even when the substrate is held. The gaps present in the clamped state and the size of the gap 42 may be determined by one of the minimum size of the opening, the size of the substrate, and the thermal conditions. The latter case includes the substrate, the frame 30, and the thermal extension of the fixed plate to which the frame 30 can be fixed. According to some embodiments, the gap is small enough to not interfere with substrate coating quality.

根據可與此處所述其他實施例結合之一些實施例,框件之至少一者係固定地貼附於固定板50,且框件之至少一者係配置以相對於固定板50可移動。於第6及7圖中所示之例子中,框件32係固定地貼附於固定板50,其中框件31係配置以相對於固定板50可移動,如第6圖中之箭頭所示。 According to some embodiments, which may be combined with other embodiments described herein, at least one of the frame members is fixedly attached to the fixed plate 50, and at least one of the frame members is configured to be movable relative to the fixed plate 50. In the examples shown in FIGS. 6 and 7, the frame member 32 is fixedly attached to the fixing plate 50, wherein the frame member 31 is configured to be movable relative to the fixing plate 50, as indicated by the arrow in FIG. .

根據不同實施例,支承配置10可用於PVD沉積製程、CVD沉積製程、基板成型磨邊(substrate structuring edging)、加熱(例如是退火)或任何種類之基板處理。此處所述之支承配置10之實施例及利用此種支承配置10之方法係特別對垂直方向之大面積玻璃基板之非靜止處理(也就是連續基板處理)有用處。非靜止處理一般係需要支承配置亦提供用於製程之遮罩元件。 According to various embodiments, the support arrangement 10 can be used in a PVD deposition process, a CVD deposition process, substrate structuring edging, heating (eg, annealing), or any type of substrate processing. The embodiment of the support arrangement 10 described herein and the method of using such a support arrangement 10 are particularly useful for non-stationary processing (i.e., continuous substrate processing) of large area glass substrates in the vertical direction. Non-stationary processing typically requires a support arrangement and also provides a masking element for the process.

第8圖繪示根據此處所述實施例之突出於基板表面的上方的框架30之示意圖。根據可與此處所述其他實施例結合之一些實施例,框件31、32、33及34之至少一者的至少一部分係突出於將處理之基板表面的上方,也就是基板塗佈區域。突出之框件31、32、33及34係配置以不阻礙塗佈或塗佈品質。根據 一些實施例,框架30包括一斜面,此斜面具有相對於基板表面的一角度11。以做為一例子來說,角度11係等同於或少於45°。根據一些實施例,斜面係實質上對齊於基板邊緣,使得基板表面與框架30之斜面之間沒有段差(step)。 Figure 8 is a schematic illustration of the frame 30 projecting above the surface of the substrate in accordance with embodiments described herein. According to some embodiments, which may be combined with other embodiments described herein, at least a portion of at least one of the frame members 31, 32, 33, and 34 protrudes above the surface of the substrate to be treated, that is, the substrate coated region. The protruding frame members 31, 32, 33 and 34 are configured to not impede coating or coating quality. according to In some embodiments, the frame 30 includes a bevel having an angle 11 relative to the surface of the substrate. As an example, the angle 11 is equal to or less than 45°. According to some embodiments, the bevel is substantially aligned with the edge of the substrate such that there is no step between the surface of the substrate and the bevel of the frame 30.

第9圖繪示根據實施例之沉積腔體600的示意圖。沉積腔體600係適用於沉積製程,例如是PVD或CVD製程。基板20係繪示而定位於基板傳輸裝置620上之根據此處所述實施例之具有框架30的支承配置或載體,或於支承配置或載體中。沉積材料源630係提供於處理腔體612中,面對基板20之將進行塗佈之側。沉積材料源630係提供沉積材料以沉積於基板20上。 FIG. 9 is a schematic view of a deposition chamber 600 in accordance with an embodiment. The deposition chamber 600 is suitable for use in a deposition process, such as a PVD or CVD process. Substrate 20 is illustrated as being positioned on substrate transport device 620 in a support configuration or carrier having frame 30 in accordance with embodiments described herein, or in a support arrangement or carrier. A source of deposition material 630 is provided in the processing chamber 612 facing the side of the substrate 20 where the coating will be applied. A source of deposition material 630 is provided to deposit a material onto the substrate 20.

於第9圖中,源630可為具有沉積材料於其上之靶材,或任何其他讓材料釋放而用於沉積於基板20上之配置。一般來說,材料源630可為可轉動靶材。根據一些實施例,為了定位及/或置換材料源,材料源630可為可移動的。根據其他實施例,材料源可為平面靶材。 In FIG. 9, source 630 can be a target having deposited material thereon, or any other configuration for releasing material for deposition on substrate 20. In general, material source 630 can be a rotatable target. According to some embodiments, material source 630 may be movable for positioning and/or replacing a source of material. According to other embodiments, the source of material may be a planar target.

根據一些實施例,沉積材料可根據沉積製程及已塗佈之基板隨後的應用來選擇。舉例來說,沉積材料源之沉積材料可為選自群組之一材料,此群組係由金屬、矽、氧化銦錫、及其他透明導電氧化物(transparent conductive oxides)所組成,金屬例如是鋁、鉬、鈦、銅或類似物。一般來說,可包括此些材料之氧化、氮化或碳化層可藉由從沉積材料源提供此材料來進行沉積, 或藉由反應式沉積(reactive deposition)來進行沉積,也就是說,來自沉積材料源之此材料係與來自處理氣體之像是氧、氮、或碳的元素作用。根據一些實施例,可使用薄膜電晶體材料來做為沉積材料,薄膜電晶體材料像是氧化矽、氮氧化矽、氮化矽、氧化鋁、氮氧化鋁。 According to some embodiments, the deposition material may be selected according to the deposition process and subsequent application of the coated substrate. For example, the deposition material of the deposition material source may be selected from the group consisting of metal, germanium, indium tin oxide, and other transparent conductive oxides, for example, Aluminum, molybdenum, titanium, copper or the like. In general, an oxidized, nitrided or carbonized layer that may include such materials may be deposited by providing the material from a source of deposited material. The deposition is carried out by reactive deposition, that is, the material from the source of the deposited material acts with an element from the process gas such as oxygen, nitrogen, or carbon. According to some embodiments, a thin film transistor material such as hafnium oxide, hafnium oxynitride, hafnium nitride, aluminum oxide, aluminum oxynitride may be used as the deposition material.

一般來說,基板20係提供於支承配置10之框架30之開口中。線665係範例性繪示出在腔體之操作期間沉積材料的路徑。 Generally, the substrate 20 is provided in the opening of the frame 30 of the support arrangement 10. Line 665 is illustrative of the path of depositing material during operation of the cavity.

如第9圖中所示,支承配置10不覆蓋將塗佈之表面的任何部分。此係避免基板邊有任何塗佈殘留,也就是說,沒有邊係進行塗佈。再者,基板前側可邊至邊進行塗佈。因此,根據此處所述實施例的支承配置10係適用於例如是OGS(單片式玻璃基板)方案。 As shown in Figure 9, the support arrangement 10 does not cover any portion of the surface to be coated. This avoids any coating residue on the sides of the substrate, that is, there is no edge coating. Furthermore, the front side of the substrate can be coated from side to side. Thus, the support arrangement 10 in accordance with embodiments described herein is suitable for use, for example, in an OGS (monolithic glass substrate) solution.

第10圖繪示根據此處所述實施例之用於在真空層沉積期間支承基板的方法100的流程圖。 10 is a flow chart of a method 100 for supporting a substrate during vacuum layer deposition in accordance with embodiments described herein.

根據可與此處所述其他實施例結合之一些實施例,用於在真空層沉積時期支承基板之方法包括提供101一框架,此框架係形成一開口、定位102基板於開口中、以及提供103作用於基板邊緣的一夾持力,用於在所述之基板邊緣夾持基板。 According to some embodiments, which may be combined with other embodiments described herein, a method for supporting a substrate during a vacuum layer deposition period includes providing 101 a frame that forms an opening, positions 102 a substrate in the opening, and provides 103 A clamping force acting on the edge of the substrate for holding the substrate at the edge of the substrate.

根據可與此處所述其他實施例結合之一些實施例,定位102基板於開口中包括對齊基板之一表面於框架之一表面。根據可與此處所述其他實施例結合之一些實施例,定位102基板 20於開口中包括定位基板於框架30之至少一部分,框架30之此至少一部分突出於基板之此表面的上方。 According to some embodiments, which can be combined with other embodiments described herein, positioning the substrate in the opening includes aligning one of the surfaces of the substrate to a surface of the frame. Positioning 102 substrates in accordance with some embodiments that may be combined with other embodiments described herein 20 includes positioning a substrate in at least a portion of the frame 30 in the opening, at least a portion of the frame 30 projecting above the surface of the substrate.

根據可與此處所述其他實施例結合之一些實施例,用於在真空層沉積時間支承基板之方法包括相對於彼此移動一框架之兩個或多個框件,以增大由所述之框件所形成之一開口的一尺寸,其中框件係藉由彈性構件連接,且彈性構件係提供作用於兩個或多個框件之收縮力;定位基板於開口中;以及釋放兩個或多個框件,以於基板邊緣夾持基板。 According to some embodiments, which can be combined with other embodiments described herein, a method for supporting a substrate during a vacuum layer deposition time includes moving two or more frames of a frame relative to each other to increase a dimension of one of the openings formed by the frame member, wherein the frame member is joined by an elastic member, and the elastic member provides a contraction force acting on the two or more frame members; positioning the substrate in the opening; and releasing two or a plurality of frame members for holding the substrate at the edge of the substrate.

根據此處所述一些實施例,支承配置穩固地支承基板,特別是在沉積製程期間。支承配置係避免基板邊有任何的塗佈殘留,也就是說,沒有邊會進行塗佈。根據一些實施例,支承配置不覆蓋基板前方上的基板邊區域(也就是沒有邊緣排除),使得基板前側可從邊至邊進行塗佈。當支承配置不突出於基板邊高度的上方時,表面塗佈係不受到阻礙。再者,支承配置可避免基板後側有任何(可見)的塗佈殘留。因此,根據此處所述實施例的支承配置係適用於例如是OGS(單片式玻璃基板)方案。 According to some embodiments described herein, the support arrangement supports the substrate firmly, particularly during the deposition process. The support arrangement avoids any coating residue on the sides of the substrate, that is, no coating is applied. According to some embodiments, the support arrangement does not cover the substrate edge regions on the front side of the substrate (ie, without edge exclusion) such that the front side of the substrate can be coated from side to side. When the support arrangement does not protrude above the height of the substrate side, the surface coating system is not obstructed. Furthermore, the support arrangement avoids any (visible) coating residue on the back side of the substrate. Thus, the support arrangement in accordance with the embodiments described herein is applicable to, for example, an OGS (monolithic glass substrate) solution.

綜上所述,雖然本發明已以較佳實施例揭露如上,然其並非用以限定本發明。本發明所屬技術領域中具有通常知識者,在不脫離本發明之精神和範圍內,當可作各種之更動與潤飾。因此,本發明之保護範圍當視後附之申請專利範圍所界定者為準。 In conclusion, the present invention has been disclosed in the above preferred embodiments, and is not intended to limit the present invention. A person skilled in the art can make various changes and modifications without departing from the spirit and scope of the invention. Therefore, the scope of the invention is defined by the scope of the appended claims.

10‧‧‧支承配置 10‧‧‧Support configuration

20‧‧‧基板 20‧‧‧Substrate

30‧‧‧框架 30‧‧‧Frame

31、32、33、34‧‧‧框件 31, 32, 33, 34‧‧‧ frame

Claims (16)

一種支承配置(10),用於在真空層沉積期間支承一基板(20),該支承配置(10)包括:一框架(30),具有二或多個框件(31、32、33、34),該些框件(31、32、33、34)形成一開口;以及一彈性構件(elastic means)(40),配置以提供作用於複數個基板邊緣之複數個部分之一夾持力,用於在該些基板邊緣夾持該基板(20)。 A support arrangement (10) for supporting a substrate (20) during deposition of a vacuum layer, the support arrangement (10) comprising: a frame (30) having two or more frame members (31, 32, 33, 34) The frame members (31, 32, 33, 34) form an opening; and an elastic means (40) configured to provide a clamping force for a plurality of portions of the plurality of substrate edges. For clamping the substrate (20) at the edges of the substrates. 如申請專利範圍第1項所述之支承配置(10),其中該開口係配置以容置該基板(20)。 The support arrangement (10) of claim 1, wherein the opening is configured to receive the substrate (20). 如申請專利範圍第1項所述之支承配置(10),其中該二或多個框件(31、32、33、34)係相對於彼此可移動的,且係配置以改變該開口之一尺寸。 The support arrangement (10) of claim 1, wherein the two or more frame members (31, 32, 33, 34) are movable relative to each other and configured to change one of the openings size. 如申請專利範圍第3項所述之支承配置(10),其中該彈性構件(40)係配置以提供作用於該二或多個框件(31、32、33、34)之一收縮力,用於提供該夾持力。 The support arrangement (10) of claim 3, wherein the elastic member (40) is configured to provide a contraction force acting on one of the two or more frame members (31, 32, 33, 34), Used to provide this clamping force. 如申請專利範圍第1至4項之其中一項所述之支承配置(10),其中該二或多個框件(31、32、33、34)係藉由該彈性構件(40)連接。 A support arrangement (10) according to any one of claims 1 to 4, wherein the two or more frame members (31, 32, 33, 34) are connected by the elastic member (40). 如申請專利範圍第1至4項之其中一項所述之支承配置(10),其中該二或多個框件(31、32、33、34)係覆蓋該些基板邊緣。 A support arrangement (10) according to any one of claims 1 to 4, wherein the two or more frame members (31, 32, 33, 34) cover the substrate edges. 如申請專利範圍第1至4項之其中一項所述之支承配置 (10),其中該二或多個框件(31、32、33、34)係配置而以該基板(20)之一表面對齊於該二或多個框件(31、32、33、34)之一表面的方式於該些基板邊緣夾持該基板(20)。 Supporting configuration as described in one of claims 1 to 4 (10), wherein the two or more frame members (31, 32, 33, 34) are configured such that one surface of the substrate (20) is aligned with the two or more frame members (31, 32, 33, 34) One of the surfaces holds the substrate (20) at the edge of the substrate. 如申請專利範圍第1至4項之其中一項所述之支承配置(10),其中該二或多個框件(31、32、33、34)係配置而以該些框件(31、32、33、34)之至少一者的至少一部分突出於該基板之一表面的上方的方式於該些基板邊緣夾持該基板(20)。 The support arrangement (10) of any one of claims 1 to 4, wherein the two or more frame members (31, 32, 33, 34) are configured with the frame members (31, The substrate (20) is sandwiched at the edge of the substrate by at least a portion of at least one of 32, 33, 34) protruding above the surface of one of the substrates. 如申請專利範圍第1至4項之其中一項所述之支承配置(10),其中該二或多個框件(31、32、33、34)係以金屬或塑膠製成。 A support arrangement (10) according to any one of claims 1 to 4, wherein the two or more frame members (31, 32, 33, 34) are made of metal or plastic. 如申請專利範圍第1至4項之其中一項所述之支承配置(10),其中該二或多個框件(31、32、33、34)之一表面之至少一部分係粗糙的。 A support arrangement (10) according to any one of claims 1 to 4, wherein at least a portion of one of the surfaces of the two or more frame members (31, 32, 33, 34) is rough. 如申請專利範圍第1至4項之其中一項所述之支承配置(10),其中該彈性構件(40)包括一或多個彈簧。 A support arrangement (10) according to any one of claims 1 to 4, wherein the elastic member (40) comprises one or more springs. 如申請專利範圍第1至4項之其中一項所述之支承配置(10),其中該彈性構件(40)包括一或多個彈性帶。 A support arrangement (10) according to any one of claims 1 to 4, wherein the elastic member (40) comprises one or more elastic bands. 如申請專利範圍第1至4項之其中一項所述之支承配置(10),其中該彈性構件(40)係併入該二或多個框件(31、32、33、34)中。 A support arrangement (10) according to any one of claims 1 to 4, wherein the elastic member (40) is incorporated into the two or more frame members (31, 32, 33, 34). 一種設備,用於沉積一層於一基板(20)上,該設備包括:一腔體,適用於層沉積於其中;根據申請專利範圍第1至4項之任一項之支承配置(10),位 於該腔體中;以及一沉積源,用於沉積材料以形成該層。 An apparatus for depositing a layer on a substrate (20), the apparatus comprising: a cavity adapted to deposit a layer therein; the support arrangement (10) according to any one of claims 1 to 4, Bit In the cavity; and a deposition source for depositing a material to form the layer. 一種方法(100),用於在真空層沉積期間支承一基板(20),該方法包括:提供(101)一框架(30),該框架(30)係形成一開口;定位(102)該基板(20)於該開口中;以及提供(103)作用於複數個基板邊緣之一夾持力,用於在該些基板邊緣夾持該基板(20)。 A method (100) for supporting a substrate (20) during vacuum layer deposition, the method comprising: providing (101) a frame (30), the frame (30) forming an opening; positioning (102) the substrate (20) in the opening; and providing (103) a clamping force acting on one of the plurality of substrate edges for clamping the substrate (20) at the edge of the substrate. 如申請專利範圍第14項所述之方法,其中定位(102)該基板(20)於該開口中包括對齊該基板(20)之一表面於該框架(30)之一表面,或其中定位(102)該基板(20)於該開口中包括定位該基板於突出該基板之該表面的上方之該框架(30)的至少一部分。 The method of claim 14, wherein positioning (102) the substrate (20) in the opening comprises aligning a surface of one of the substrates (20) to a surface of the frame (30), or positioning therein ( 102) The substrate (20) includes at least a portion of the frame (30) positioned to protrude the substrate above the surface of the substrate.
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