TW201508846A - Apparatus for mounting semiconductor dies - Google Patents

Apparatus for mounting semiconductor dies Download PDF

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Publication number
TW201508846A
TW201508846A TW102130993A TW102130993A TW201508846A TW 201508846 A TW201508846 A TW 201508846A TW 102130993 A TW102130993 A TW 102130993A TW 102130993 A TW102130993 A TW 102130993A TW 201508846 A TW201508846 A TW 201508846A
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Taiwan
Prior art keywords
wafer
module
package carrier
conveying mechanism
pressing
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TW102130993A
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Chinese (zh)
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TWI528472B (en
Inventor
Tun-Chih Shih
Ee Sun Lim
Yi-Lun Lin
Chien-Chia Su
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Gallant Micro Machining Co Ltd
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Publication of TWI528472B publication Critical patent/TWI528472B/en

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Abstract

An apparatus for mounting semiconductor dies is a package mechanism capable of performing die bonding or multi-die stacking. The apparatus comprises a first feeding mechanism, a second feeding mechanism, a pre-bonding module and a main bonding module. The first feeding mechanism and the second feeding mechanism respectively send substrates to where the pre-bonding module performs pre-bonding, and respectively send or hold the substrates at where the main bonding module performs main bonding. The pre-bonding module presses at least one die onto the substrate or another die on the substrate for pre-bonding. Afterward, the bonding heads included in the main bonding module simultaneously press pre-bonded dies and perform main bonding to affix the dies to a substrate or the dies on the substrate.

Description

黏著半導體晶片之裝置 Device for bonding semiconductor wafers

本發明係關於一種黏著半導體晶片之裝置,尤係關於一種用於製作半導體電子元件於黏晶(die bonding)製程中所需的封裝裝置。 BACKGROUND OF THE INVENTION 1. Field of the Invention This invention relates to a device for attaching a semiconductor wafer, and more particularly to a package device for fabricating a semiconductor electronic component in a die bonding process.

於整個半導體封裝製程中,緊接於晶圓切割後之製程為黏晶(或稱為固晶、上片或黏片)製程,其係將晶圓上因切割道切開後之各獨立晶片(或晶粒;die)依序取放至導線架或基板上,並藉由黏膠(例如:銀膠)或膠帶將導線架及晶片相互穩固結合。 In the entire semiconductor packaging process, the process immediately after the wafer dicing is a die-bonding (or solid crystal, top film or adhesive film) process, which is a separate wafer on the wafer after being cut by the scribe line ( Or the die; the die is sequentially placed on the lead frame or the substrate, and the lead frame and the wafer are firmly bonded to each other by an adhesive (for example, silver glue) or tape.

圖1A係一習知黏晶機之主要機構示意圖。基板5(substate)由輸送導軌19左邊進料端載入,被依序載入之複數個基板5係由進料夾爪17往輸送導軌19之出料端傳送。基板5會經過裝黏膠之注射筒狀容器8及點膠頭9下方,容器8內之黏膠會經由點膠頭9吐出於基板5上各單元。另外,取放機構11會依序拿取晶圓15上之晶片10,該晶圓15係固定於一薄膜上,而藉由擴張機構12使薄膜拉伸而將晶片10彼此距離拉開。被取放機構11拿起之晶片10會移到輸送導軌19端,並往下運動直至將晶片10固定於基板5上之膠材。 FIG. 1A is a schematic diagram of a main mechanism of a conventional die bonder. The substrate 5 is loaded by the left feed end of the transport rail 19, and the plurality of substrates 5 sequentially loaded are transported by the feed jaws 17 to the discharge end of the transport rail 19. The substrate 5 passes under the adhesive cylindrical container 8 and the dispensing head 9, and the adhesive in the container 8 is discharged through the dispensing head 9 to the units on the substrate 5. In addition, the pick-and-place mechanism 11 sequentially takes the wafer 10 on the wafer 15, and the wafer 15 is fixed on a film, and the film 10 is stretched by the expansion mechanism 12 to pull the wafers 10 away from each other. The wafer 10 picked up by the pick-and-place mechanism 11 is moved to the end of the transport rail 19 and moved downward until the wafer 10 is fixed to the glue on the substrate 5.

由於晶片10固定於基板5上需要花費較多之時間,尤其是對於較大面積之晶片10更是需要較多之時間才能使膠材合適地擠出於四周。若是將膠材換為聚乙醯胺(polyimide)材質之膠帶則每個晶片10需要更多之時間,約需要壓合2至3秒才能有效結合晶片10與基板5,因此很明顯晶片10壓合過程會成為該習知黏晶機之瓶頸動作,亦即每小時產出量(unit per hour;UPH)會受到影響而降低。相較於使用黏膠,當使用膠帶為結合晶片與基板5之物質時,每小時產出量會大幅降低。 Since it takes a lot of time for the wafer 10 to be fixed on the substrate 5, especially for the wafer 10 of a larger area, it takes more time for the glue to be properly extruded around. If the adhesive material is replaced with a tape made of polyimide material, each wafer 10 requires more time, and it takes about 2 to 3 seconds to bond the wafer 10 and the substrate 5 effectively, so that the wafer 10 is obviously pressed. The process will become the bottleneck action of the conventional die bonder, that is, the unit per hour (UPH) will be affected and reduced. Compared to the use of adhesives, when tape is used to bond the wafer to the substrate 5, the throughput per hour is greatly reduced.

因應薄型封裝及多晶片堆疊(multi-chip stacking)封裝之需求加劇,晶片之厚度需降至3 mil(約76.2 μm)。圖1B係一多晶片堆疊封裝之示意圖,其中基板5上堆疊有多個晶片10,該等晶片之尺寸亦可以不同。由於超薄晶片之溢膠會更難控制,如此黏膠無法再作為黏著超薄晶片之膠材。亦即使用膠帶係超薄晶片之較佳選擇,然前述對每小時產出量之不利影響,則得要有更佳之解決方法或機構設計始能兼顧量產及品質之雙重需求。 Due to the increased demand for thin package and multi-chip stacking packages, the thickness of the wafer needs to be reduced to 3 mils (about 76.2 μm). 1B is a schematic diagram of a multi-wafer stack package in which a plurality of wafers 10 are stacked on a substrate 5, and the sizes of the wafers may also be different. Since the overflow of the ultra-thin wafer is more difficult to control, the adhesive can no longer be used as a glue for the ultra-thin wafer. That is to say, the use of tape is a better choice for ultra-thin wafers. However, the above-mentioned adverse effects on the throughput per hour require a better solution or a design that can both meet the dual needs of mass production and quality.

尤其是,取放機構拾取超薄晶片時需以特殊頂出機構配合,並得以較慢的作業模式才能確保晶片不碎裂,如此更造成了產能很大的瓶頸,亦即每小時產出量會因此而更低。 In particular, the pick-and-place mechanism needs to be equipped with a special ejection mechanism when picking up the ultra-thin wafer, and a slower operation mode can ensure that the wafer does not break, which causes a large bottleneck of productivity, that is, an output per hour. It will be lower.

習知黏晶機除了單位時間產量不佳外,其所運用之進料夾爪17受到基板5翹曲問題之嚴重考驗。尤其當從事於多晶片模組(multi-chip Module;MCM)封裝時,薄型之基板5在黏著首顆晶粒後受到烘烤溫度影響會產生翹曲。該些進料夾爪17是以接力方式交替傳輸至出料端,基板5翹曲經常造成進料夾爪17交替換手時無法正確夾緊而定位,因此造成基板5與輸送導軌19間碰撞而卡料, 甚至基板5上晶片10因刮傷或晶崩而需要報廢。 In addition to the poor production per unit time, the conventional die-clamping machine 17 is subjected to the severe test of the warpage of the substrate 5. Especially when working in a multi-chip module (MCM) package, the thin substrate 5 is warped by the baking temperature after the first die is adhered. The feeding jaws 17 are alternately transmitted to the discharge end by a relay. The warping of the substrate 5 often causes the feeding jaws 17 to be properly clamped and positioned when the hand is replaced, thereby causing collision between the substrate 5 and the conveying guide 19. And the card, Even the wafer 10 on the substrate 5 needs to be scrapped due to scratching or crystal collapse.

綜上所述,半導體封裝設備市場上亟需要一種能顯著提昇單位時間產量及製程品質之黏著半導體晶片的裝置,並且還要降低黏晶製程中不該有的停機率及報廢率。 In summary, there is a need in the semiconductor packaging equipment market for a device that can significantly increase the yield per unit time and process quality of the bonded semiconductor wafer, and also reduce the downtime and scrap rate that should not be in the die bonding process.

本發明之目的係提供一種黏著半導體晶片之裝置,其係藉由多軌進料及輸送導線架或基板,可同時(或接近同時)於多軌間進行分段壓合黏晶之步驟,故能顯著提昇裝置之單位時間產量。 The object of the present invention is to provide a device for bonding a semiconductor wafer, which is capable of simultaneously (or nearly simultaneously) performing a stepwise press-bonding of a die bond between a plurality of tracks by multi-track feeding and transporting a lead frame or a substrate. Significantly increase the unit time production of the unit.

本發明之另一目的係提供一種具預壓及主壓之分段壓合晶片功能之黏晶裝置,執行主壓之主壓合模組又包含多個壓合頭,故可同時壓合多個晶片與基板充分結合,並能與執行預壓之預壓合模組所需之預壓時間匹配,因此能有效提升該裝置之單位時間產量。 Another object of the present invention is to provide a die bonding device with a pre-pressed and a main pressure segmented wafer-bonding function. The main pressing module for performing the main pressure further comprises a plurality of pressing heads, so that the pressing can be simultaneously performed. The wafers are fully integrated with the substrate and can be matched with the pre-compression time required to perform the pre-compression pre-compression module, thereby effectively increasing the unit time yield of the device.

本發明之另一目的係提供一種分路徑取放晶片之黏晶裝置,以兩個多頭機構分別作為預壓與取晶模組,自晶圓係接續取放晶片至導線架或基板處,預壓及取晶片可同時或幾乎同時處理,因此能有效提升該裝置之單位時間產量。 Another object of the present invention is to provide a die bonding device for split-and-drop wafers, in which two multi-head mechanisms are respectively used as pre-pressing and crystal-splitting modules, and the wafers are successively taken from the wafer system to the lead frame or the substrate. Pressing and taking wafers can be processed simultaneously or almost simultaneously, thus effectively increasing the unit time yield of the device.

為達上述目的,本發明提供一種黏著半導體晶片之裝置,係用於將晶片黏著固定或多晶片堆疊於封裝載體上,包含:一預壓模組,會施加壓力使至少一個晶片與一封裝載體或一封裝載體上另一晶片進行預壓合;一主壓合模組,包括複數個壓合頭,會同時施壓複數個已完成預壓合之晶片,並使該複數個晶片與一封裝載體或一封裝載體上另複數個晶片進行主要壓合;一第一進料輸送機構;一第二進料輸送機構,該第一進料輸送機構及該第二進料輸送 機構係分別傳送封裝載體至該預壓模組執行預定壓合之處,及分別傳送或停留已完成預壓合之封裝載體於該主壓合模組執行主要壓合之處;其中該預定壓合之處及該主要壓合之處均可分別移動,且位於該第一進料輸送機構及該第二進料輸送機構上。 In order to achieve the above object, the present invention provides an apparatus for bonding a semiconductor wafer for attaching a wafer or a multi-wafer to a package carrier, comprising: a pre-press module that applies pressure to at least one wafer and a package carrier Or pre-compression of another wafer on a package carrier; a main compression module, comprising a plurality of compression heads, simultaneously pressing a plurality of pre-compressed wafers, and making the plurality of wafers and a package a plurality of wafers on the carrier or a package carrier for primary pressing; a first feed conveying mechanism; a second feeding conveying mechanism, the first feeding conveying mechanism and the second feeding conveying The mechanism respectively transmits the package carrier to the pre-pressing module to perform predetermined pressing, and respectively transmits or stops the pre-compressed package carrier to perform main pressing at the main pressing module; wherein the predetermined pressure The combination and the main pressing position can be respectively moved and located on the first feeding conveying mechanism and the second feeding conveying mechanism.

本發明另提供一種黏著半導體晶片之裝置,係用於將晶片黏著固定或多晶片堆疊於封裝載體上,包含:一預壓模組,會施加壓力使至少一個晶片與一封裝載體或一封裝載體上另一晶片進行預壓合;一主壓合模組,包括複數個壓合頭,會同時施壓複數個已完成預壓合之晶片,並使該複數個晶片與一封裝載體或一封裝載體上另複數個晶片進行主要壓合;以及複數個進料輸送機構,可以載台方式傳送封裝載體,係分別移載傳送封裝載體至該預壓模組執行預定壓合之處,及分別傳送或停留已完成預壓合之封裝載體於該主壓合模組執行主要壓合之處,並可直接連續往復移載封裝載體於預壓模組壓合與主壓模組壓合之處以完成多層晶片堆疊壓合,並節省對封裝載體重覆定位的時間。其中該預定壓合之處及該主要壓合之處均分別位於該複數個進料輸送機構上。 The invention further provides a device for bonding a semiconductor wafer, which is used for bonding a wafer or a multi-wafer on a package carrier, comprising: a pre-pressing module, applying pressure to at least one wafer and a package carrier or a package carrier The other wafer is pre-compressed; a main press-fit module, including a plurality of press-bonding heads, simultaneously presses a plurality of pre-compressed wafers, and the plurality of wafers and a package carrier or a package The plurality of wafers on the carrier are mainly pressed; and the plurality of feeding and conveying mechanisms can transport the package carrier in a carrier manner, and respectively transfer the package carrier to the pre-pressing module to perform predetermined pressing, and respectively transmit Or stopping the pre-compression of the package carrier to perform the main pressing of the main compression module, and directly and continuously reciprocally transfer the package carrier to press the pre-press module and the main pressure module to complete The multilayer wafer stack is laminated and saves time for repositioning the package carrier. Wherein the predetermined compression and the main compression are respectively located on the plurality of feed conveying mechanisms.

5‧‧‧基板 5‧‧‧Substrate

8‧‧‧注射筒狀容器 8‧‧‧Injection cylindrical container

9‧‧‧點膠頭 9‧‧‧ dispensing head

10‧‧‧晶片 10‧‧‧ wafer

11‧‧‧取放機構 11‧‧‧ pick-and-place mechanism

12‧‧‧擴張機構 12‧‧‧Expansion agencies

15‧‧‧晶圓 15‧‧‧ wafer

17‧‧‧進料夾爪 17‧‧‧Feed jaws

19‧‧‧輸送導軌 19‧‧‧Conveyor rails

20‧‧‧黏著半導體晶片之裝置 20‧‧‧Devices for attaching semiconductor wafers

21‧‧‧物料傳送模組 21‧‧‧Material Transfer Module

22‧‧‧預壓模組 22‧‧‧Preloading module

23‧‧‧主壓合模組 23‧‧‧Main compression module

24‧‧‧晶圓承載模組 24‧‧‧ Wafer Carrying Module

25‧‧‧晶片取放模組 25‧‧‧ wafer pick and place module

26‧‧‧定位臺機構 26‧‧‧ Positioning station mechanism

29‧‧‧出料傳送機構 29‧‧‧Output transfer mechanism

80~83‧‧‧封裝載體 80~83‧‧‧Package carrier

27a‧‧‧封裝載體進料機構 27a‧‧‧Package carrier feeding mechanism

27b‧‧‧封裝載體出料機構 27b‧‧‧Package carrier discharge mechanism

211‧‧‧第一進料輸送機構 211‧‧‧First feed conveyor

212‧‧‧第二進料輸送機構 212‧‧‧Second feed conveying mechanism

221‧‧‧取放頭 221‧‧‧Remove the head

231‧‧‧壓合頭 231‧‧‧ Pressing head

251‧‧‧取放頭 251‧‧‧Remove the head

291‧‧‧第一視覺辨識單元 291‧‧‧First Visual Identification Unit

292‧‧‧第二視覺辨識單元 292‧‧‧Second Visual Identity Unit

293‧‧‧第三視覺辨識單元 293‧‧‧ Third Visual Identification Unit

為方便該等實施方式之進一步描述,提供了如下附圖,其中:圖1A係一習知黏晶機之主要機構示意圖;圖1B係一習知晶片堆疊之結構示意圖;圖2A係本發明黏著半導體晶片之裝置之立體圖;圖2B係本發明第三視覺辨識單元在封裝載體上取像之示意圖;圖3A係本發明裝置執行封裝載體之載入、預壓合及主要壓合之示意圖;圖3B係本發明裝置執行封裝載體之載入、預壓合、主要壓合及卸載之示意圖;及圖3C係本發明裝置執行封裝載體之載入、預壓合、主要壓合及卸載之示意圖。 In order to facilitate further description of the embodiments, the following drawings are provided, wherein: FIG. 1A is a schematic diagram of a main mechanism of a conventional die bonder; FIG. 1B is a schematic structural view of a conventional wafer stack; FIG. 2A is a structure of the present invention. FIG. 2B is a schematic view of the third visual recognition unit of the present invention for taking an image on a package carrier; FIG. 3A is a schematic diagram of loading, pre-compression, and main pressing of the package carrier of the device of the present invention; 3B is a schematic diagram of loading, pre-compression, main pressing and unloading of a package carrier by the apparatus of the present invention; and FIG. 3C is a schematic diagram of loading, pre-compression, main pressing and unloading of the package carrier by the apparatus of the present invention.

為展示的簡化和清晰,附圖展示了總體之構造方式,並且眾所周知的特徵和技術的描述和細節可以略去以避免使本發明不必要地模糊。另外,附圖中的要素不必按照大小繪製。例如,附圖中的一些要素的大小相對於其他要素可以被放大以幫助改善對本發明的實施方式的理解。在不同附圖中的相同參考數字表示相同的要素。 The simplifications and clarity of the present invention are shown in the drawings, and the description and details of the features and techniques may be omitted to avoid unnecessarily obscuring the present invention. In addition, the elements in the drawings are not necessarily drawn to size. For example, the size of some of the elements in the figures may be exaggerated relative to other elements to help improve the understanding of the embodiments of the invention. The same reference numbers are used in the different drawings in the drawings.

說明書和申請專利範圍中的用語“第一”、“第二”、“第三”、“第四”等等(如果有的話)用於在類似的要素之間區分,並且不必按照特別的序列或時間順序描述。應理解這樣使用的術語在合適的情況下是可互換的以便在此描述的實施方式例如能夠按不同於描述的那些或在此以其他方式描述的順序工作。此外,用語“包含”、“包括”和“具有”以及其任何變化形式旨在覆蓋非排他性的包括,以便包括一系列要素的程序、方法、系統、物件、裝置、或設備不必限制於那些要素,而是可以包括未清楚地列出或這樣的程序、方法、系統、專案、裝置、或設備固有的其他要素。 The terms "first", "second", "third", "fourth", etc. (if any) in the specification and claims are used to distinguish between similar elements and do not have to be Sequence or chronological description. It is to be understood that the terms so used are interchangeable, where appropriate, such that the embodiments described herein can operate, for example, in a different order than those described or otherwise described herein. In addition, the terms "comprising," "comprising," and "having,", and,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,, Rather, it may include other elements that are not explicitly listed or such programs, methods, systems, projects, devices, or devices.

說明書和申請專利範圍中的用語“左”、“右”、“前”、“後”、“頂部”、“底部”、“上”、“下”等等(如果有的話)用於描述的目的,而不必視為一定的相對位置。應理解使用這樣的用語在合適的情況下是可互換的,以便在此描述的實施方式能夠在不同於描述的那些或其他方向工作。 The terms "left", "right", "front", "back", "top", "bottom", "upper", "lower", etc. (if any) in the specification and claims are used to describe The purpose, without having to be considered a certain relative position. It is to be understood that the use of such terms is interchangeable, where appropriate, so that the embodiments described herein can operate in other or different orientations.

圖2A係本發明黏著半導體晶片之裝置之立體圖。黏著半導體晶片之裝置20主要包含物料傳送模組21、預壓模組22及主壓合模組23,又另包含晶圓承載模組24、晶片取放模組25、定 位臺機構26、封裝載體進料機構27a、封裝載體出料機構27b及出料傳送機構28。 2A is a perspective view of the apparatus for adhering a semiconductor wafer of the present invention. The device 20 for bonding a semiconductor chip mainly comprises a material transfer module 21, a pre-press module 22 and a main press-fit module 23, and further comprises a wafer carrier module 24, a wafer pick-and-place module 25, and a fixed The stage mechanism 26, the package carrier feeding mechanism 27a, the package carrier discharging mechanism 27b, and the discharge conveying mechanism 28.

晶片取放模組25用以拾取晶圓承載模組24上之晶圓15的晶片10,並將拾取之晶片10放置於定位臺機構26上。藉由晶圓承載模組24上方之第一視覺辨識單元291擷取晶圓15之影像,可以辨識及調整晶圓承載模組24之位置及旋轉角度,並辨識晶片之記號或不完整晶片,以利晶片取放模組25最佳地拾取(或吸取)晶片10。於本實施例中,晶片取放模組25係具有兩個取放頭251,故可同時或依序拾取兩個晶片10,較有利於提昇裝置之單位時間產量。該取放頭251之數量不受實施例所限制,也可為一個或三個以上。當拾取晶圓承載模組24(晶片取放模組25)將晶片10放置於定位臺機構26上,該定位臺機構26可以藉由第二視覺辨識單元292校準晶片10之位置及角度,以利預壓模組22自定位臺機構26最佳地拾取晶片15。 The wafer pick-and-place module 25 is used to pick up the wafer 10 of the wafer 15 on the wafer carrier module 24 and place the picked wafer 10 on the positioning stage mechanism 26. By capturing the image of the wafer 15 by the first visual recognition unit 291 above the wafer carrier module 24, the position and rotation angle of the wafer carrier module 24 can be identified and adjusted, and the wafer marks or incomplete wafers can be identified. The wafer pick-and-place module 25 is optimally picked up (or picked up) by the wafer. In the present embodiment, the wafer pick-and-place module 25 has two pick-and-place heads 251, so that the two wafers 10 can be picked up simultaneously or sequentially, which is advantageous for the unit time production of the lifting device. The number of the pick-and-place heads 251 is not limited by the embodiment, and may be one or three or more. When the wafer carrier module 24 (the wafer pick-and-place module 25) is picked up, the wafer 10 is placed on the positioning mechanism 26, and the positioning mechanism 26 can align the position and angle of the wafer 10 by the second visual recognition unit 292. The preload module 22 optimally picks up the wafer 15 from the positioning stage mechanism 26.

該預壓模組22將拾取之晶片10移動至位於物料傳送模組21上之封裝載體80,同時對晶片10與封裝載體80施予一壓力,使晶片10暫時黏合於封裝載體80上。該物料傳送模組21包括第一進料輸送機構211及第二進料輸送機構212,其上之封裝載體80係自封裝載體進料機構27a所供應。於本實施例中,預壓模組22係具有兩個取放頭221,故可同時或依序拾取兩個晶片10,較有利於提昇裝置之單位時間產量。但該取放頭221之數量不受實施例所限制,也可為一個或三個以上。上述封裝載體80係為基板(例如印刷電路板)或導線架。 The pre-press module 22 moves the picked wafer 10 to the package carrier 80 on the material transfer module 21, and simultaneously applies a pressure to the wafer 10 and the package carrier 80 to temporarily bond the wafer 10 to the package carrier 80. The material transfer module 21 includes a first feed transport mechanism 211 and a second feed transport mechanism 212, on which the package carrier 80 is supplied from the package carrier feed mechanism 27a. In the present embodiment, the pre-press module 22 has two pick-and-place heads 221, so that the two wafers 10 can be picked up simultaneously or sequentially, which is advantageous for the unit time production of the lifting device. However, the number of the pick-and-place heads 221 is not limited by the embodiment, and may be one or three or more. The package carrier 80 described above is a substrate (such as a printed circuit board) or a lead frame.

第一進料輸送機構211及第二進料輸送機構212(本發 明並不限於兩輸送機構,多個輸送機構亦為本發明之主張)係分別傳送封裝載體80至該預壓模組22執行預定壓合之處,及分別傳送或停留已完成預定壓合之封裝載體80於主壓合模組23執行主要壓合之處。預壓合之處及主要壓合之處係位於第一進料輸送機構211及第二進料輸送機構212上設定之位置,可依照預壓模組22及主壓合模組23之設計而定,詳細說明請參見圖3A~3B及後相應描述段落。又該兩進料輸送機構可依據封裝載體80之大小不同而調整軌道寬度。 First feed conveying mechanism 211 and second feeding conveying mechanism 212 (this hair It is not limited to two transport mechanisms, and the plurality of transport mechanisms are also claimed in the present invention) that the package carrier 80 is separately transferred to the pre-press module 22 to perform predetermined pressing, and the predetermined press-fit is respectively transmitted or stopped. The package carrier 80 performs the main compression at the main compression module 23. The pre-compression and the main compression are located at the positions set by the first feeding conveying mechanism 211 and the second feeding conveying mechanism 212, and can be designed according to the design of the pre-pressing module 22 and the main pressing module 23. For details, please refer to Figures 3A~3B and the corresponding description paragraphs. Moreover, the two feed conveying mechanisms can adjust the track width according to the size of the package carrier 80.

當第一進料輸送機構211及第二進料輸送機構212其中一者會將封裝載體80送至預壓合之處,該封裝載體80或其上之晶片會與預壓模組22放置之晶片間進行初步之結合固定,即預壓模組22會藉由取放頭221施壓晶片以進行預壓。藉由第三視覺辨識單元293在封裝載體80上取像,可以精準控制晶片之初步固定或堆疊位置。當預壓模組22將複數個晶片依序黏合於封裝載體80上之期間,同時另一進料輸送機構將先前已完成預壓之封裝載體80送至或停留於主要壓合之處,主壓合模組23之複數個壓合頭231會一起施壓複數個已完成預壓合之晶片表面,使該等晶片充分結合至封裝載體80或其上之晶片。如此藉由多軌輸送線間之交替進行預壓及主壓之黏晶步驟,就能有效省去個別模組或機構間彼此互相等待時間,進而提升該裝置20之單位時間產量。此外,該第一進料輸送機構211及第二進料輸送機構212上封裝載體80所固定之晶片10可以為不同之等級或分類,例如:第一進料輸送機構211上封裝載體80所固定之晶片10是A等級或分類bin 1,又第二進料輸送機構212上封裝載體80所固定之晶片10可以是B等級或分類bin 2。 When one of the first feed transport mechanism 211 and the second feed transport mechanism 212 sends the package carrier 80 to the pre-compression, the package carrier 80 or the wafer thereon is placed with the pre-press module 22 The preliminary bonding between the wafers is performed, that is, the pre-pressing module 22 presses the wafer by the pick-and-place head 221 to perform pre-compression. By taking the image on the package carrier 80 by the third visual recognition unit 293, the initial fixing or stacking position of the wafer can be precisely controlled. When the pre-pressing module 22 sequentially bonds a plurality of wafers onto the package carrier 80, the other feeding mechanism sends or otherwise stops the pre-compressed package carrier 80 to the main pressing place. The plurality of press heads 231 of the press-fit module 23 apply a plurality of pre-compressed wafer surfaces together to fully bond the wafers to the package carrier 80 or wafer thereon. Thus, by performing the pre-pressing and the main-pressure bonding step between the multi-track conveying lines, the waiting time between the individual modules or the mechanisms can be effectively saved, thereby increasing the unit time production of the device 20. In addition, the wafers 10 fixed by the package carrier 80 on the first feed conveying mechanism 211 and the second feeding conveying mechanism 212 may be of different grades or classifications, for example, the first carrier conveying mechanism 211 is fixed by the package carrier 80. The wafer 10 is of the A grade or classification bin 1, and the wafer 10 fixed by the package carrier 80 on the second feed transport mechanism 212 may be of the B grade or the classification bin 2.

如圖2B所示實施例中,於該封裝載體80或其上之晶片與預壓模組22放置之晶片間進行初步之結合固定前,第三視覺辨識單元293會在封裝載體80上取像,此時吸附一晶片10之取放頭221係位於封裝載體80上一預定固定之位置。該第三視覺辨識單元293可以分別擷取晶片10和封裝載體80之影像,亦可以同時擷取晶片10和封裝載體80之共同影像,藉由分析影像中晶片10和封裝載體80之相對位置以精準控制晶片之初步固定或堆疊位置。 In the embodiment shown in FIG. 2B, the third visual recognition unit 293 takes an image on the package carrier 80 before the package carrier 80 or the wafer thereon and the wafer placed on the pre-press module 22 are initially bonded and fixed. At this time, the pick-and-place head 221 for adsorbing a wafer 10 is located at a predetermined fixed position on the package carrier 80. The third visual recognition unit 293 can respectively capture the images of the wafer 10 and the package carrier 80, and simultaneously capture the common image of the wafer 10 and the package carrier 80, by analyzing the relative positions of the wafer 10 and the package carrier 80 in the image. Precise control of the initial fixing or stacking position of the wafer.

本實施例中主要壓合模組23有4個壓合頭231,但不受此實施例所限制,也可為一個或複數個。此外,預壓模組22之複數個取放頭221及主要壓合模組23之複數個壓合頭231可以個別控制施加於晶片表面之力量(或壓力)。亦即針對不同之晶片10可以有不同之力量調整,俾使晶片10與封裝載體80之結合最佳化。 In this embodiment, the main pressing module 23 has four pressing heads 231, but it is not limited by this embodiment, and may be one or plural. In addition, the plurality of pick and place heads 221 of the pre-press module 22 and the plurality of press heads 231 of the main press-fit module 23 can individually control the force (or pressure) applied to the surface of the wafer. That is, different strength adjustments can be made for different wafers 10 to optimize the combination of wafer 10 and package carrier 80.

第一進料輸送機構211及第二進料輸送機構212可以選用移動載臺(如圖式)將封裝載體80傳送至預壓合之處及主要壓合之處,因此沒有類似夾爪交接傳送之動作所造成卡料或干涉之風險,尤其適用於薄型或翹曲量較大之封裝載體80。又封裝載體進料機構27a可以在第一進料輸送機構211及第二進料輸送機構212之進料端反復移動,將需要執行預壓合之封裝載體80分別載入第一進料輸送機構211及第二進料輸送機構212。出料傳送機構28也會在第一進料輸送機構211及第二進料輸送機構212之出料端反復移動,接受已完成主要壓合步驟之封裝載體80,並卸載至封裝載體出料機構27b內。該封裝載體出料機構27b可選擇和出料傳送機構28同樣之移動,以利封裝載體80被卸載至封裝載體出料機構27b上彈匣(magazine)內。 The first feeding conveying mechanism 211 and the second feeding conveying mechanism 212 can select the moving carrier (as shown) to transfer the package carrier 80 to the pre-compression point and the main pressing place, so there is no similar jaw transfer transmission. The risk of jamming or interference caused by the action is particularly applicable to the package carrier 80 having a small thickness or a large amount of warpage. The package carrier feeding mechanism 27a can be repeatedly moved at the feeding ends of the first feeding conveying mechanism 211 and the second feeding conveying mechanism 212, and the package carrier 80 that needs to perform pre-compression is respectively loaded into the first feeding conveying mechanism. 211 and a second feed conveying mechanism 212. The discharge conveying mechanism 28 also repeatedly moves at the discharge ends of the first feeding conveying mechanism 211 and the second feeding conveying mechanism 212, accepts the package carrier 80 that has completed the main pressing step, and unloads it to the package carrier discharging mechanism. Within 27b. The package carrier discharge mechanism 27b can be selectively moved in the same manner as the discharge conveyor mechanism 28, so that the package carrier 80 is unloaded into the magazine on the package carrier discharge mechanism 27b.

圖3A及3C係本發明裝置執行封裝載體之載入、預壓合及主要壓合之示意圖,及圖3B係本發明裝置執行封裝載體之載入、預壓合、主要壓合及卸載之示意圖。於本實施例中,預定壓合之處係分別位於第一進料輸送機構211及第二進料輸送機構212遠離進料段(左側之封裝載體進料機構27a,圖未示出)之半側,又主要壓合之處係位於第二進料輸送機構212及第一進料輸送機構211靠近進料段之半側。然,預壓合之處及主要壓合之處不受此實施例之限制,可視主壓合模組23及預壓模組22之運動範圍及組裝位置而定。 3A and 3C are schematic diagrams showing the loading, pre-compression, and main pressing of the package carrier of the apparatus of the present invention, and FIG. 3B is a schematic diagram of loading, pre-compression, main pressing and unloading of the package carrier by the apparatus of the present invention. . In the present embodiment, the predetermined pressing points are respectively located at half of the first feeding conveying mechanism 211 and the second feeding conveying mechanism 212 away from the feeding section (the left side packaging carrier feeding mechanism 27a, not shown). The side, and the main compression, is located on the half of the second feed conveying mechanism 212 and the first feeding conveying mechanism 211 near the feeding section. However, the pre-compression and the main compression are not limited by this embodiment, and may depend on the range of motion and assembly position of the main compression module 23 and the pre-pressure module 22.

參見圖3A,需要執行預壓合步驟之封裝載體81自封裝載體進料機構27a向右第一進料輸送機構211上預壓合之處,該封裝載體81或其上之晶片會與預壓模組22放置之晶片間進行初步之結合固定。當在等待預壓模組22將複數個晶片依序黏合於封裝載體81上之期間,第二進料輸送機構212將先前已完成預壓之封裝載體82停留在主要壓合之處,主壓合模組23將使該等晶片充分結合至封裝載體82或其上之晶片。完成主要壓合之封裝載體82就向右移送至出料傳送機構28上,如圖3B所示。或是再回到預壓合區進行再上一層晶片的預壓合,如圖3C所示。 Referring to FIG. 3A, the package carrier 81 that needs to perform the pre-compression step is pre-compressed from the package carrier feeding mechanism 27a to the right first feeding mechanism 211, and the package carrier 81 or the wafer thereon is pre-compressed. A preliminary bond is fixed between the wafers placed by the module 22. While waiting for the pre-press module 22 to sequentially bond the plurality of wafers onto the package carrier 81, the second feed transport mechanism 212 stops the previously completed pre-pressed package carrier 82 at the main press-fit, the main pressure The module 23 will fully bond the wafers to the package carrier 82 or wafer thereon. The package carrier 82, which is primarily crimped, is transferred to the right to the discharge conveyor 28 as shown in Figure 3B. Or return to the pre-nip zone for pre-compression of the previous wafer, as shown in Figure 3C.

參見圖3B,第一進料輸送機構211會將已預壓之封裝載體81向左送至主要壓合之處,又主要壓合模組23會自第二進料輸送機構212移置第一進料輸送機構211上方,以進行封裝載體81之主要壓合步驟。同時第二進料輸送機構212其可自封裝載體進料機構27a內,將需要執行預壓合步驟之封裝載體83向右送至預壓合之處,預壓模組22可自定位臺機構26拾取晶片10及越過第一進料 輸送機構211上方,並使該等晶片初步結合至封裝載體83或其上之晶片。完成主要壓合之封裝載體81將會向右移送至出料傳送機構28上,又出料傳送機構28當然也會向下移置第一進料輸送機構211之右側(圖未示)。完成預壓合之封裝載體83可左移,等待主要壓合模組23進行主要壓合步驟(如圖3A所示封裝載體82的位置)。由於進料輪送機構為載台式,進料輸送機構211與212移載封裝載體往復於預壓合與主壓合之處,第三視覺定位模組293只需對封裝載體作一次視覺定位,即可完成多層晶片的堆疊,故可提昇生產的效率。 Referring to FIG. 3B, the first feeding and conveying mechanism 211 sends the pre-pressed package carrier 81 to the left to the main pressing position, and the main pressing module 23 is displaced from the second feeding mechanism 212. Above the feed conveying mechanism 211, a main pressing step of the package carrier 81 is performed. At the same time, the second feeding mechanism 212 can self-package the carrier feeding mechanism 27a, and the package carrier 83 that needs to perform the pre-compression step is sent to the right to the pre-compression point, and the pre-pressing module 22 can be self-positioning mechanism. 26 picking up the wafer 10 and crossing the first feed Above the transport mechanism 211, the wafers are initially bonded to the package carrier 83 or wafer thereon. The package carrier 81 that has completed the primary press will be transferred to the right to the discharge conveyor 28, and the discharge conveyor 28 will of course also be displaced downwardly to the right of the first feed conveyor 211 (not shown). The pre-compressed package carrier 83 can be moved to the left, waiting for the main compression module 23 to perform the main pressing step (the position of the package carrier 82 as shown in FIG. 3A). Since the feeding and conveying mechanism is a carrier, the feeding and conveying mechanisms 211 and 212 transfer the package carrier to and from the pre-compression and the main pressing, and the third visual positioning module 293 only needs to visually position the package carrier. The stacking of the multilayer wafers can be completed, thereby increasing the efficiency of production.

如前所述超薄晶片在黏晶時,因為溢膠的考量,因此必需用薄膜膠材(film)來貼合超薄晶片至封裝載體或其上之晶片。薄膜膠材貼合必需配合溫度與壓合時間來使材料接近完全固化,通常需要1秒~2秒。因此若以傳統機構完成晶片取放並壓合,步驟周期(cycle time)將很長(約1.5 sec~2.5 sec),故會造成生產效率不佳。若採預壓合及主要壓合之分段步驟,由於預壓合動作約需要0.1 sec,故整個預壓合步驟之cycle time可以是0.6 sec。本發明實施例中主要壓合模組有4個壓合頭,壓合動作約需要2 sec,但一次完成4晶片之主要壓合。因此主要壓合步驟之cycle time約為0.6 sec。然,預壓合及主要壓合之分段步驟係分軌道且幾乎同時被執行,故整個壓合步驟之cycle time仍約為0.6 sec,約是傳統機構所需2.5 sec的4分次一,故前開實施例有約4倍的生產效率之提昇。 As described above, in the case of ultra-thin wafers, when it is bonded, it is necessary to use a film to adhere the ultra-thin wafer to the package carrier or the wafer thereon. The bonding of the film glue must be combined with the temperature and the pressing time to make the material nearly completely cured, usually taking 1 second to 2 seconds. Therefore, if the wafer is pick-and-placed and pressed by a conventional mechanism, the cycle time will be long (about 1.5 sec to 2.5 sec), which may result in inefficient production. If the pre-pressing and main pressing step is carried out, since the pre-compression operation requires about 0.1 sec, the cycle time of the entire pre-compression step can be 0.6 sec. In the embodiment of the present invention, the main pressing module has four pressing heads, and the pressing action takes about 2 sec, but the main pressing of the four wafers is completed at one time. Therefore, the cycle time of the main pressing step is about 0.6 sec. However, the pre-compression and primary compression stepping steps are performed in a sub-track and are performed almost simultaneously, so the cycle time of the entire pressing step is still about 0.6 sec, which is about 4 sec. of 2.5 sec required by the conventional mechanism. Therefore, the previous embodiment has an increase in production efficiency of about 4 times.

前開第一進料輸送機構211、二進料輸送機構212及出料傳送機構28可包括傳送平臺、真空吸附裝置或夾持裝置以利封裝載體之傳送,前兩者並可進一步另具有加熱裝置,能增進薄膜膠材之固化。 The front opening first feeding conveying mechanism 211, the two feeding conveying mechanism 212 and the discharging conveying mechanism 28 may comprise a conveying platform, a vacuum adsorption device or a clamping device to facilitate the conveying of the package carrier, and the first two may further have a heating device Can improve the curing of film glue.

本發明之技術內容及技術特點已揭示如上,然而熟悉本項技術之人士仍可能基於本發明之教示及揭示而作種種不背離本發明精神之替換及修飾。因此,本發明之保護範圍應不限於實施例所揭示者,而應包括各種不背離本發明之替換及修飾,並為以下之申請專利範圍所涵蓋。 The technical and technical features of the present invention have been disclosed as above, and those skilled in the art can still make various substitutions and modifications without departing from the spirit and scope of the invention. Therefore, the scope of the present invention should be construed as being limited by the scope of the appended claims

10‧‧‧晶片 10‧‧‧ wafer

15‧‧‧晶圓 15‧‧‧ wafer

20‧‧‧黏著半導體晶片之裝置 20‧‧‧Devices for attaching semiconductor wafers

21‧‧‧物料傳送模組 21‧‧‧Material Transfer Module

22‧‧‧預壓模組 22‧‧‧Preloading module

23‧‧‧主壓合模組 23‧‧‧Main compression module

24‧‧‧晶圓承載模組 24‧‧‧ Wafer Carrying Module

25‧‧‧晶片取放模組 25‧‧‧ wafer pick and place module

26‧‧‧定位臺機構 26‧‧‧ Positioning station mechanism

28‧‧‧出料傳送機構 28‧‧‧Output transfer mechanism

80‧‧‧封裝載體 80‧‧‧Package carrier

27a‧‧‧封裝載體進料機構 27a‧‧‧Package carrier feeding mechanism

27b‧‧‧封裝載體出料機構 27b‧‧‧Package carrier discharge mechanism

211‧‧‧第一進料輸送機構 211‧‧‧First feed conveyor

212‧‧‧第二進料輸送機構 212‧‧‧Second feed conveying mechanism

221‧‧‧取放頭 221‧‧‧Remove the head

231‧‧‧壓合頭 231‧‧‧ Pressing head

251‧‧‧取放頭 251‧‧‧Remove the head

291‧‧‧第一視覺辨識單元 291‧‧‧First Visual Identification Unit

292‧‧‧第二視覺辨識單元 292‧‧‧Second Visual Identity Unit

293‧‧‧第三視覺辨識單元 293‧‧‧ Third Visual Identification Unit

Claims (12)

一種黏著半導體晶片之裝置,係用於將晶片黏著固定或多晶片堆疊於封裝載體上,包含:一預壓模組,會取放並施加壓力使至少一個晶片與一封裝載體或一封裝載體上另一晶片進行預壓合;一主壓合模組,包括複數個壓合頭,會同時施壓複數個已完成預壓合之晶片,並使該複數個晶片與一封裝載體或一封裝載體上另複數個晶片進行主要壓合;一第一進料輸送機構;以及一第二進料輸送機構,該第一進料輸送機構及該第二進料輸送機構係分別傳送封裝載體至該預壓模組執行預定壓合之處,及分別傳送或停留已完成預壓合之封裝載體於該主壓合模組執行主要壓合之處;其中該預定壓合之處及該主要壓合之處均分別位於該第一進料輸送機構及該第二進料輸送機構上。 A device for attaching a semiconductor wafer for bonding a wafer or a multi-wafer to a package carrier, comprising: a pre-press module that picks up and applies pressure to at least one wafer and a package carrier or a package carrier The other wafer is pre-compressed; a main press-fit module comprising a plurality of press-bonding heads simultaneously presses a plurality of pre-compressed wafers, and the plurality of wafers and a package carrier or a package carrier The plurality of wafers are subjected to main pressing; a first feeding conveying mechanism; and a second feeding conveying mechanism, the first feeding conveying mechanism and the second feeding conveying mechanism respectively conveying the package carrier to the pre-feed The pressing module performs a predetermined pressing, and respectively transfers or stops the pre-compressed package carrier to perform main pressing at the main pressing module; wherein the predetermined pressing portion and the main pressing portion Each of the locations is located on the first feed conveying mechanism and the second feeding conveying mechanism. 如申請專利範圍第1項所述之黏著半導體晶片之裝置,其另包含:一晶圓承載模組,承載一晶圓,該晶圓包括複數個晶片;一晶片取放模組,包括至少一個取放頭,自該晶圓承載模組上之該晶圓拾取至少一個晶片;以及一定位臺機構,供該晶片取放模組放置該晶片,並調整該晶片之位置或角度; 其中該預壓模組係包括至少一個取放頭,自該定位臺機構拾取至少一個晶片,並放置於一封裝載體上。 The device for attaching a semiconductor wafer according to claim 1, further comprising: a wafer carrying module, carrying a wafer, the wafer comprising a plurality of wafers; and a wafer pick-and-place module comprising at least one Receiving a pick-up head, picking up at least one wafer from the wafer on the wafer carrying module; and a positioning stage mechanism for the wafer pick-and-place module to place the wafer and adjusting the position or angle of the wafer; The pre-press module includes at least one pick-and-place head from which at least one wafer is picked up and placed on a package carrier. 如申請專利範圍第1項所述之黏著半導體晶片之裝置,其另包含一出料傳送機構,該出料傳送機構會自該第一進料輸送機構及該第二進料輸送機構接受已完成主要壓合之封裝載體。 The device for attaching a semiconductor wafer according to claim 1, further comprising a discharge conveying mechanism, wherein the discharge conveying mechanism receives the completion from the first feeding conveying mechanism and the second feeding conveying mechanism The main packaged package carrier. 如申請專利範圍第2項所述之黏著半導體晶片之裝置,其中該晶片取放模組同時或依序拾取該晶圓的兩個或多個厚度為3mil以下的晶片。 The device for attaching a semiconductor wafer according to claim 2, wherein the wafer pick-and-place module simultaneously or sequentially picks up two or more wafers having a thickness of 3 mil or less. 如申請專利範圍第1項所述之黏著半導體晶片之裝置,其中該第一進料輸送機構及該第二進料輸送機構係分別以單一載台移載該封裝載體,又該載台往復移載該封裝載體於該預壓模組之該預定壓合與該主壓模組之該主要壓合之處之間。 The device for attaching a semiconductor wafer according to claim 1, wherein the first feeding conveying mechanism and the second feeding conveying mechanism respectively transfer the package carrier by a single stage, and the stage reciprocates And loading the package carrier between the predetermined pressing of the pre-pressing module and the main pressing of the main pressing module. 如申請專利範圍第2項所述之黏著半導體晶片之裝置,其中該預壓模組包括至少兩個取放頭,又該主壓合模組包括至少兩個壓合頭,晶片取放模組包括至少兩個取放頭。 The device for attaching a semiconductor wafer according to claim 2, wherein the pre-press module comprises at least two pick-and-place heads, and the main press-fit module comprises at least two press-fit heads, and the wafer pick-and-place module Includes at least two pick and place heads. 如申請專利範圍第2項所述之黏著半導體晶片之裝置,其另包含:一第一視覺辨識單元,設置於該晶圓承載模組上,用以擷取該晶圓之影像;及 一第二視覺辨識單元,設置於該定位臺機構上,用以擷取該該定位臺機構上之晶片的影像。 The device for attaching a semiconductor wafer according to claim 2, further comprising: a first visual identification unit disposed on the wafer carrier module for capturing an image of the wafer; A second visual recognition unit is disposed on the positioning mechanism to capture an image of the wafer on the positioning mechanism. 如申請專利範圍第1項所述之黏著半導體晶片之裝置,其另包含一第三視覺辨識單元,該第三視覺辨識單元取定位及像位於該第一進料輸送機構及該第二進料輸送機構上之該封裝載體,其中該預壓模組藉由該第三視覺辨識單元擷取該封裝載體之影像,可控制該晶片固定於該封裝載體之位置。 The device for attaching a semiconductor wafer according to claim 1, further comprising a third visual identification unit, wherein the third visual recognition unit is located at the first feeding conveying mechanism and the second feeding The package carrier on the transport mechanism, wherein the pre-press module captures the image of the package carrier by the third visual recognition unit, and controls the position of the wafer to be fixed to the package carrier. 如申請專利範圍第1項所述之黏著半導體晶片之裝置,其中該預壓模組係於該第一進料輸送機構及該第二進料輸送機構其中一者上進行預壓合,及該主壓合模組同時於其中另一者上進行主要壓合,又完成前述預壓合及主要壓合後,該第一進料輸送機構及該第二進料輸送機構再分別交換進行預壓合及主要壓合。 The device for bonding a semiconductor wafer according to claim 1, wherein the pre-pressing module is pre-compressed on one of the first feeding conveying mechanism and the second feeding conveying mechanism, and After the main pressing and closing module performs the main pressing on the other of the other, and after the pre-compression and the main pressing are completed, the first feeding conveying mechanism and the second feeding conveying mechanism are respectively exchanged for pre-compression. Combined with the main press. 如申請專利範圍第1項所述之黏著半導體晶片之裝置,其中該第一進料輸送機構及該第二進料輸送機構上該封裝載體所固定之晶片係分別為不同之等級或分類。 The device for attaching a semiconductor wafer according to claim 1, wherein the first feeding mechanism and the chip feeding mechanism of the second feeding mechanism are different grades or classifications. 如申請專利範圍第8項所述之黏著半導體晶片之裝置,其中該第三視覺辨識單元係分別擷取該晶片和該封裝載體之影像,或同時擷取該晶片和該封裝載體之共同影像。 The device for attaching a semiconductor wafer according to claim 8, wherein the third visual recognition unit respectively captures an image of the wafer and the package carrier, or simultaneously captures a common image of the wafer and the package carrier. 如申請專利範圍第6項所述之黏著半導體晶片之裝置,其中該預壓模組之至少兩個取放頭係個別控制施加於該晶片之力量,及該主壓合模組之至少兩個壓合頭係個別控制施加於該晶片之力量。 The device for bonding a semiconductor wafer according to claim 6, wherein at least two pick and place heads of the pre-pressing module individually control the force applied to the wafer, and at least two of the main pressing modules The press head individually controls the force applied to the wafer.
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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI620656B (en) * 2015-05-08 2018-04-11 均華精密工業股份有限公司 Pressing apparatus with an ability of manufacturing different products/same products
CN108878298A (en) * 2017-05-12 2018-11-23 鸿骐新技股份有限公司 Biological identification chip module sealed in unit and its packaging method
TWI732277B (en) * 2018-08-27 2021-07-01 德商紐豹有限責任合資公司 Viewing device and method for viewing with the help of the viewing device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI620656B (en) * 2015-05-08 2018-04-11 均華精密工業股份有限公司 Pressing apparatus with an ability of manufacturing different products/same products
CN108878298A (en) * 2017-05-12 2018-11-23 鸿骐新技股份有限公司 Biological identification chip module sealed in unit and its packaging method
TWI732277B (en) * 2018-08-27 2021-07-01 德商紐豹有限責任合資公司 Viewing device and method for viewing with the help of the viewing device

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