TW201508722A - El display device and drive method for el display device - Google Patents

El display device and drive method for el display device Download PDF

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TW201508722A
TW201508722A TW103125096A TW103125096A TW201508722A TW 201508722 A TW201508722 A TW 201508722A TW 103125096 A TW103125096 A TW 103125096A TW 103125096 A TW103125096 A TW 103125096A TW 201508722 A TW201508722 A TW 201508722A
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voltage
light
emitting
column
data
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Jun Ogura
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Toppan Printing Co Ltd
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    • GPHYSICS
    • G09EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09GARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/22Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources
    • G09G3/30Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels
    • G09G3/32Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED]
    • G09G3/3208Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED]
    • G09G3/3225Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED] using an active matrix
    • G09G3/3233Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED] using an active matrix with pixel circuitry controlling the current through the light-emitting element
    • GPHYSICS
    • G09EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09GARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2300/00Aspects of the constitution of display devices
    • G09G2300/08Active matrix structure, i.e. with use of active elements, inclusive of non-linear two terminal elements, in the pixels together with light emitting or modulating elements
    • G09G2300/0809Several active elements per pixel in active matrix panels
    • G09G2300/0842Several active elements per pixel in active matrix panels forming a memory circuit, e.g. a dynamic memory with one capacitor
    • G09G2300/0861Several active elements per pixel in active matrix panels forming a memory circuit, e.g. a dynamic memory with one capacitor with additional control of the display period without amending the charge stored in a pixel memory, e.g. by means of additional select electrodes
    • G09G2300/0866Several active elements per pixel in active matrix panels forming a memory circuit, e.g. a dynamic memory with one capacitor with additional control of the display period without amending the charge stored in a pixel memory, e.g. by means of additional select electrodes by means of changes in the pixel supply voltage
    • GPHYSICS
    • G09EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09GARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/22Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources
    • G09G3/30Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels
    • G09G3/32Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED]
    • G09G3/3208Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED]
    • G09G3/3266Details of drivers for scan electrodes
    • GPHYSICS
    • G09EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09GARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/22Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources
    • G09G3/30Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels
    • G09G3/32Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED]
    • G09G3/3208Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED]
    • G09G3/3275Details of drivers for data electrodes
    • G09G3/3291Details of drivers for data electrodes in which the data driver supplies a variable data voltage for setting the current through, or the voltage across, the light-emitting elements
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K10/00Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having a potential-jump barrier or a surface barrier
    • H10K10/40Organic transistors
    • H10K10/46Field-effect transistors, e.g. organic thin-film transistors [OTFT]
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K59/00Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
    • H10K59/10OLED displays
    • H10K59/12Active-matrix OLED [AMOLED] displays
    • H10K59/121Active-matrix OLED [AMOLED] displays characterised by the geometry or disposition of pixel elements

Abstract

An EL display device that, during a light-emission period, holds a voltage corresponding to a light-emission voltage in a storage capacitor (Cs) and causes a current corresponding to the light-emission voltage to flow to an EL element (11) via a drive transistor (Tr3). During a non-light-emission period, the EL display device holds a voltage corresponding to a non-light-emission voltage in the storage capacitor (Cs) and sets the voltage for a power supply end such that the current that has flowed through the drive transistor (Tr3) does not flow to the EL element (11). The EL display device has a state in which the non-light-emission voltage is lower the higher the light-emission voltage.

Description

EL顯示裝置及EL顯示裝置之驅動方法 EL display device and driving method of EL display device

本揭示之技術係有關於具備經由驅動電晶體供給電流之Electro-Luminesence元件(EL元件,電致發光元件)的EL顯示裝置及EL顯示裝置之驅動方法。 The technology disclosed in the present disclosure relates to an EL display device including an Electro-Luminesence element (EL element, electroluminescence device) that supplies a current through a driving transistor, and a driving method of the EL display device.

EL顯示裝置具備複數個像素電路,複數個像素電路之每一者係包括驅動電晶體、取樣電晶體及保持電容。保持電容接在驅動電晶體之閘極-源極間,取樣電晶體將因應於灰階資料之位準的電壓寫入保持電容。驅動電晶體係以在飽和區域動作之方式所構成,並將因應於保持電容所保持之電壓的汲極電流供給至EL元件。EL元件係藉汲極電流所驅動,而以因應於灰階資料之亮度發光(例如,參照專利文獻1)。 The EL display device has a plurality of pixel circuits, and each of the plurality of pixel circuits includes a driving transistor, a sampling transistor, and a holding capacitor. The holding capacitor is connected between the gate and the source of the driving transistor, and the sampling transistor writes the voltage to the holding capacitor according to the level of the gray scale data. The driving electro-crystal system is configured to operate in a saturation region, and supplies a drain current in accordance with a voltage held by the holding capacitor to the EL element. The EL element is driven by the drain current and emits light in accordance with the luminance of the gray scale data (for example, refer to Patent Document 1).

[先前技術文獻] [Previous Technical Literature] [專利文獻] [Patent Literature]

[專利文獻1]日本特開2010-128397號公報 [Patent Document 1] Japanese Patent Laid-Open Publication No. 2010-128397

取樣電晶體對保持電容所寫入之電壓對驅動電晶體之閘極-源極間賦予單一的極性。在顯示影像之EL 顯示裝置中,在顯示影像的期間,重複這種寫入。而且,因為對驅動電晶體之閘極-源極間以單一極性重複施加電壓,所以在驅動電晶體中,進行閘極-源極間之臨限值電壓的位移(shift)。 The voltage written by the sampling transistor to the holding capacitor imparts a single polarity to the gate-source of the driving transistor. EL showing image In the display device, such writing is repeated while the image is being displayed. Further, since the voltage is repeatedly applied to the gate and the source of the driving transistor with a single polarity, the shift of the threshold voltage between the gate and the source is performed in the driving transistor.

在此時,被施加於驅動電晶體之閘極-源極間的電壓係因應於灰階資料之位準(level),因為各像素所求得之亮度的灰階係一般相異,所以臨限值電壓之位移的程度亦依各像素而異。結果,構成一個顯示面之複數個像素的每一者係對灰階資料之亮度彼此相異。 At this time, the voltage applied between the gate and the source of the driving transistor is in accordance with the level of the gray scale data, because the gray scale of the luminance obtained by each pixel is generally different, so The degree of displacement of the limit voltage also varies from pixel to pixel. As a result, each of the plurality of pixels constituting one display surface is different in brightness from the gray scale data.

本揭示之技術的目的在於提供抑制驅動電晶體之臨限值電壓的位移依各像素而異之EL顯示裝置及EL顯示裝置的驅動方法。 An object of the technology of the present disclosure is to provide an EL display device and a driving method of an EL display device that suppress displacement of a threshold voltage of a driving transistor depending on each pixel.

本揭示之EL顯示裝置的一形態具備複數個像素電路,而該像素電路包括驅動電晶體、EL元件及保持電容。該驅動電晶體係具有閘極、源極及汲極,該源極與該汲極之任一方係連接端,在該源極與該汲極中另一方係供電端。該EL元件係與該連接端電性連接,該保持電容係與該閘極與該源極電性連接。該EL顯示裝置係以如下之方式所構成,在發光期間,在該保持電容保持相當於發光電壓之電壓,而使因應於該發光電壓之電流經由該驅動電晶體流至該EL元件;在不發光期間,在該保持電容保持相當於不發光電壓之電壓,並以已通過該驅動電晶體之電流不流至該EL元件的方式設定該供電端的電壓;具有該發光電壓愈高時該不發光電壓愈低之狀 態。 One aspect of the EL display device of the present disclosure includes a plurality of pixel circuits including a driving transistor, an EL element, and a holding capacitor. The driving transistor system has a gate, a source and a drain, and the source is connected to one of the drains, and the other of the source and the drain is a power supply end. The EL element is electrically connected to the connection end, and the holding capacitor is electrically connected to the gate and the source. The EL display device is configured to maintain a voltage corresponding to a light-emitting voltage in the light-holding period during light-emitting, and to cause a current corresponding to the light-emitting voltage to flow to the EL element via the driving transistor; During the illuminating period, the holding capacitor maintains a voltage corresponding to the non-emissive voltage, and sets the voltage of the power supply terminal so that the current that has passed through the driving transistor does not flow to the EL element; the higher the illuminating voltage, the lower the illuminating voltage The lower the voltage state.

本揭示之EL顯示裝置之其他的形態係具備複數個像素電路之EL顯示裝置的驅動方法,該像素電路包括驅動電晶體、EL元件及保持電容。該驅動電晶體係具有閘極、源極及汲極,該源極與該汲極之任一方係連接端,在該源極與該汲極中另一方係供電端。該EL元件係與該連接端電性連接,該保持電容係與該閘極與該源極電性連接。該EL顯示裝置之驅動方法包括:發光步驟,係在該保持電容保持相當於發光電壓之電壓,而使因應於該發光電壓之電流經由該驅動電晶體流至該EL元件;及不發光步驟,係在該保持電容保持相當於以具有該發光電壓愈高時愈低之狀態的方式所設定之不發光電壓的電壓,並以已通過該驅動電晶體之電流不流至該EL元件的方式設定該供電端的電壓。 Another aspect of the EL display device of the present disclosure is a driving method of an EL display device including a plurality of pixel circuits including a driving transistor, an EL element, and a holding capacitor. The driving transistor system has a gate, a source and a drain, and the source is connected to one of the drains, and the other of the source and the drain is a power supply end. The EL element is electrically connected to the connection end, and the holding capacitor is electrically connected to the gate and the source. The driving method of the EL display device includes: a light emitting step of maintaining a voltage corresponding to a light emitting voltage at the holding capacitor, and causing a current corresponding to the light emitting voltage to flow to the EL element via the driving transistor; and a non-light emitting step, A voltage of a non-light-emitting voltage that is set so as to maintain a state in which the holding capacitance is lower than a state in which the light-emitting voltage is higher, and is set such that a current that has passed through the driving transistor does not flow to the EL element. The voltage at the supply terminal.

若依據本揭示之EL顯示裝置的一形態,在複數個驅動電晶體之每一者,被施加於閘極與源極之間的電壓係在EL元件發光時愈高,在EL元件不發光時愈低。因此,抑制驅動電晶體之臨限值電壓的位移依各像素而異。 According to an aspect of the EL display device of the present disclosure, in each of the plurality of driving transistors, a voltage applied between the gate and the source is higher when the EL element emits light, and when the EL element does not emit light The lower. Therefore, the displacement of the threshold voltage of the driving transistor is suppressed depending on each pixel.

本揭示之EL顯示裝置之其他的形態係以重複由該發光期間與該不發光期間所構成之圖框的方式所構成,並具有該發光電壓愈高之該圖框該不發光電壓愈低之狀態。 Another aspect of the EL display device of the present disclosure is configured to repeat a frame formed by the light-emitting period and the non-light-emitting period, and the frame having the higher light-emitting voltage has a lower non-light-emitting voltage. status.

若依據本揭示之EL顯示裝置之其他的形態,在是顯示之重複之最短期間的各圖框抑制驅動電晶體 之臨限值電壓的位移依各像素而異。 According to another aspect of the EL display device of the present disclosure, each frame in the shortest period of display repetition suppresses the driving transistor The displacement of the threshold voltage varies from pixel to pixel.

在本揭示之EL顯示裝置之其他的形態,該不發光電壓係將在該發光電壓之設定範圍中的中間值作為基準,並與該發光電壓對稱的反轉電壓。 In another aspect of the EL display device of the present disclosure, the non-light-emitting voltage is a reverse voltage symmetrical with the light-emitting voltage with an intermediate value in a set range of the light-emitting voltage as a reference.

若依據本揭示之EL顯示裝置之其他的形態,與發光電壓對稱的反轉電壓被用作不發光電壓。因此,經由一次之發光期間與一次之不發光期間被施加於閘極與源極之間的電壓係在複數個像素均一。因此,抑制驅動電晶體之臨限值電壓的位移依各像素而異之效果係更提高。 According to another aspect of the EL display device of the present disclosure, an inverted voltage that is symmetrical with the light-emitting voltage is used as the non-light-emitting voltage. Therefore, the voltage applied between the gate and the source through one light-emitting period and one-time non-light-emitting period is uniform in a plurality of pixels. Therefore, the effect of suppressing the displacement of the threshold voltage of the driving transistor to be different depending on each pixel is further improved.

在本揭示之EL顯示裝置之其他的形態,該像素電路係以如下之方式所構成,在該發光期間之該發光電壓與切換值相同或比其低時,將係極性與該發光電壓相同,而且該發光電壓愈高時被設定成愈低的電壓作為該不發光電壓,由該保持電容保持;在該發光期間之該發光電壓比該切換值高時,將極性與該發光電壓係相異的電壓作為該不發光電壓,由該保持電容保持。 In another aspect of the EL display device of the present disclosure, the pixel circuit is configured to have the same polarity as the light-emitting voltage when the light-emitting voltage is the same as or lower than the switching value during the light-emitting period. Further, the higher the illuminating voltage is set, the lower the voltage is used as the non-emissive voltage, and is held by the holding capacitor; when the illuminating voltage is higher than the switching value during the illuminating period, the polarity is different from the illuminating voltage system. The voltage is held as the non-emissive voltage by the holding capacitor.

在發光期間之發光電壓愈高,愈進行驅動電晶體之臨限值電壓的位移。若依據本揭示之EL顯示裝置之其他的形態,發光電壓比切換值高時,在保持電容保持相當於極性與發光電壓係相異之不發光電壓的電壓。因此,在特定像素過度地進行驅動電晶體之臨限值電壓之位移的情況,對該特定像素抑制臨限值電壓之位移。結果,抑制驅動電晶體之臨限值電壓的位移依各像素而異之效果所及的範圍係對臨限值電壓之位移的程度被擴大。 The higher the luminescence voltage during luminescence, the more the displacement of the threshold voltage of the driving transistor is performed. According to another aspect of the EL display device of the present disclosure, when the light-emitting voltage is higher than the switching value, the holding capacitor maintains a voltage corresponding to a non-light-emitting voltage having a polarity different from that of the light-emitting voltage. Therefore, in the case where the displacement of the threshold voltage of the driving transistor is excessively performed by the specific pixel, the displacement of the threshold voltage is suppressed for the specific pixel. As a result, the range in which the displacement of the threshold voltage of the driving transistor is suppressed depending on the respective pixels is expanded to the extent of the displacement of the threshold voltage.

在本揭示之EL顯示裝置之其他的形態,該像素電路係以在該發光期間之該發光電壓比該切換值高時,將該不發光電壓設為定值的方式所構成。 In another aspect of the EL display device of the present disclosure, the pixel circuit is configured to set the non-light-emitting voltage to a constant value when the light-emitting voltage during the light-emitting period is higher than the switching value.

若依據本揭示之EL顯示裝置之其他的形態,因為極性與發光電壓係相異之不發光電壓係定值,所以可圖謀簡化不發光電壓之產生所需的構成。 According to another aspect of the EL display device of the present disclosure, since the polarity is different from the illuminating voltage system, the non-light-emitting voltage is constant, so that it is possible to simplify the configuration required for the non-light-emitting voltage.

在本揭示之EL顯示裝置之其他的形態,該像素電路係以如下之方式所構成,在該不發光期間,包含檢測出該驅動電晶體之臨限值電壓的檢測動作;在該發光期間,使用上次之檢測動作的檢測結果,預先修正該發光電壓。 In another aspect of the EL display device of the present disclosure, the pixel circuit is configured to include a detection operation for detecting a threshold voltage of the driving transistor during the non-light-emitting period; and during the light-emitting period, The light-emitting voltage is corrected in advance using the detection result of the last detection operation.

在本揭示之EL顯示裝置之其他的形態,該不發光步驟更包含檢測出該驅動電晶體之臨限值電壓的檢測步驟;在該發光步驟,使用上次之該檢測步驟的檢測結果,預先修正該發光電壓。 In another aspect of the EL display device of the present disclosure, the non-illuminating step further includes a detecting step of detecting a threshold voltage of the driving transistor; and in the illuminating step, using the detection result of the detecting step last time, in advance Correct the illuminating voltage.

若依據本揭示之技術之其他的形態,抑制由驅動電晶體之臨限值電壓的變化所引起之EL元件之亮度的變化。 According to another aspect of the technology of the present disclosure, the change in the luminance of the EL element caused by the change in the threshold voltage of the driving transistor is suppressed.

若依據本揭示之EL顯示裝置及EL顯示裝置之驅動方法,可抑制驅動電晶體之臨限值電壓的位移依各像素而異。 According to the EL display device and the EL display device driving method of the present disclosure, it is possible to suppress the displacement of the threshold voltage of the driving transistor to be different for each pixel.

β‧‧‧電流放大率 Β‧‧‧current amplification

t‧‧‧緩和時間 T‧‧‧moderation time

Ce‧‧‧像素電容 Ce‧‧‧pixel capacitor

Cp‧‧‧寄生電容 Cp‧‧‧ parasitic capacitance

Cs‧‧‧保持電容 Cs‧‧‧Resistance Capacitor

Id‧‧‧汲極電流 Id‧‧‧汲polar current

L1、L2‧‧‧曲線 L1, L2‧‧‧ curve

La‧‧‧電源線 La‧‧‧Power cord

Lb‧‧‧接地電壓線 Lb‧‧‧ grounding voltage line

Ld‧‧‧資料線 Ld‧‧‧ data line

LP‧‧‧鎖存脈衝信號 LP‧‧‧Latch pulse signal

Ls‧‧‧掃描線 Ls‧‧‧ scan line

MP‧‧‧掩蔽脈衝信號 MP‧‧‧masking pulse signal

Px‧‧‧像素 Px‧‧ pixels

ts‧‧‧飽和時間 Ts‧‧‧saturated time

VD‧‧‧發光電壓 VD‧‧‧ luminous voltage

VDN‧‧‧不發光電壓 VDN‧‧‧ non-lighting voltage

VDN1‧‧‧第1不發光電壓 VDN1‧‧‧1st non-lighting voltage

VDN2‧‧‧第2不發光電壓 VDN2‧‧‧2nd non-lighting voltage

VM‧‧‧檢測用電壓 VM‧‧‧Detection voltage

Din‧‧‧顯示資料 Din‧‧‧Display information

11‧‧‧有機EL元件 11‧‧‧Organic EL components

PCC‧‧‧驅動電路 PCC‧‧‧ drive circuit

SP1、SP2‧‧‧起動脈衝信號 SP1, SP2‧‧‧ start pulse signal

SW1‧‧‧輸入開關 SW1‧‧‧ input switch

SW2‧‧‧輸出開關 SW2‧‧‧ output switch

SWd‧‧‧顯示用開關 SWd‧‧‧ display switch

SWm‧‧‧檢測用開關 SWm‧‧‧Detection switch

SWs‧‧‧檢測用電壓開關 SWs‧‧ ‧ voltage switch for detection

Tr1‧‧‧取樣電晶體 Tr1‧‧‧Sampling transistor

Tr2‧‧‧切換電晶體 Tr2‧‧‧Switching transistor

Tr3‧‧‧驅動電晶體 Tr3‧‧‧ drive transistor

VEE‧‧‧類比基準電壓 VEE‧‧‧ analog reference voltage

VgH‧‧‧選擇電壓 VgH‧‧‧Select voltage

VgL‧‧‧非選擇電壓 VgL‧‧‧ non-selective voltage

Vgs‧‧‧閘極-源極間電壓 Vgs‧‧‧ gate-source voltage

VLd‧‧‧資料線電位 VLd‧‧‧ data line potential

Vth‧‧‧臨限值電壓 Vth‧‧‧ threshold voltage

△Vth‧‧‧位移量 △Vth‧‧‧ displacement

Clkd‧‧‧資料位移時脈信號 Clkd‧‧‧ data displacement clock signal

Clks‧‧‧顯示用位移時脈信號 Clks‧‧‧ shows displacement clock signal

Clkr‧‧‧檢測用位移時脈信號 Clkr‧‧‧Displacement clock signal for detection

Dout‧‧‧檢測資料 Dout‧‧‧Test data

DVSS‧‧‧類比電源電壓 DVSS‧‧‧ analog power supply voltage

LVDD‧‧‧邏輯電源電壓 LVDD‧‧‧ logic supply voltage

LVSS‧‧‧邏輯基準電壓 LVSS‧‧‧Logical Reference Voltage

VLds‧‧‧飽和電壓 VLds‧‧‧Saturation voltage

ELVDD‧‧‧驅動電壓 ELVDD‧‧‧ drive voltage

ELVSS‧‧‧基準電壓 ELVSS‧‧ ‧ reference voltage

SWtrs‧‧‧傳輸開關 SWtrs‧‧‧Transmission switch

WDVSS‧‧‧寫入電壓 WDVSS‧‧ ‧ write voltage

10‧‧‧顯示面板 10‧‧‧ display panel

20‧‧‧選擇驅動器 20‧‧‧Select drive

21‧‧‧移位暫存器電路 21‧‧‧Shift register circuit

22‧‧‧位準位移器電路 22‧‧‧ position shifter circuit

23‧‧‧緩衝電路 23‧‧‧ snubber circuit

30‧‧‧電源驅動器 30‧‧‧Power Driver

40‧‧‧資料驅動器 40‧‧‧Data Drive

41‧‧‧移位暫存器電路 41‧‧‧Shift register circuit

42‧‧‧資料暫存器電路 42‧‧‧data register circuit

43‧‧‧資料鎖存電路 43‧‧‧ Data Latch Circuit

43a‧‧‧資料鎖存器 43a‧‧‧ Data Latch

44‧‧‧電壓變換電路 44‧‧‧Voltage conversion circuit

45‧‧‧緩衝電路 45‧‧‧ buffer circuit

46‧‧‧位準位移器 46‧‧‧ position shifter

50‧‧‧控制部 50‧‧‧Control Department

51‧‧‧影像信號輸入部 51‧‧‧Image Signal Input Department

52‧‧‧時序控制器 52‧‧‧Timing controller

53‧‧‧記憶部 53‧‧‧Memory Department

54‧‧‧影像信號處理部 54‧‧‧Image Signal Processing Department

55‧‧‧顯示資料輸出部 55‧‧‧Display data output department

60‧‧‧邏輯電源 60‧‧‧Logical power supply

70‧‧‧類比電源 70‧‧‧ analog power supply

第1圖係表示第1實施形態之EL顯示裝置之整體構成 的方塊圖。 Fig. 1 is a view showing the overall configuration of an EL display device of the first embodiment. Block diagram.

第2圖係表示第1圖之EL顯示裝置所具備的控制部及選擇驅動器之構成的方塊圖。 Fig. 2 is a block diagram showing the configuration of a control unit and a selection driver included in the EL display device of Fig. 1.

第3圖係表示第1圖之EL顯示裝置所具備的資料驅動器及像素電路之構成的方塊圖。 Fig. 3 is a block diagram showing the configuration of a data driver and a pixel circuit provided in the EL display device of Fig. 1.

第4圖係表示在1圖之EL顯示裝置,被施加於資料線之發光電壓與被施加於資料線之不發光電壓之關係的曲線圖。 Fig. 4 is a graph showing the relationship between the light-emitting voltage applied to the data line and the non-light-emitting voltage applied to the data line in the EL display device of Fig. 1.

第5圖係第1圖之EL顯示裝置所具備之像素電路的電路圖,係表示發光用之寫入操作時之狀態的圖。 Fig. 5 is a circuit diagram of a pixel circuit provided in the EL display device of Fig. 1 and is a view showing a state at the time of a write operation for light emission.

第6圖係第1圖之EL顯示裝置所具備之像素電路的電路圖,係表示發光操作時之狀態的圖。 Fig. 6 is a circuit diagram of a pixel circuit provided in the EL display device of Fig. 1 and is a view showing a state at the time of light-emitting operation.

第7圖係第1圖之EL顯示裝置所具備之像素電路的電路圖,係表示不發光用之寫入操作時之狀態的圖。 Fig. 7 is a circuit diagram of a pixel circuit provided in the EL display device of Fig. 1 and is a view showing a state at the time of a write operation for non-light-emitting.

第8圖係第1圖之EL顯示裝置所具備之像素電路的電路圖,係表示不發光操作時之狀態的圖。 Fig. 8 is a circuit diagram of a pixel circuit provided in the EL display device of Fig. 1 showing a state in which no light is emitted.

第9圖係表示第1圖之EL顯示裝置在發光期間被施加於掃描線及電源線的電壓之變遷與被輸入至資料驅動器之控制信號之變遷的時序圖。 Fig. 9 is a timing chart showing the transition of the voltage applied to the scanning line and the power supply line during the light-emitting period of the EL display device of Fig. 1 and the transition of the control signal input to the data driver.

第10圖係表示第1圖之EL顯示裝置在不發光期間被施加於掃描線及電源線的電壓之變遷與被輸入至資料驅動器之控制信號之變遷的時序圖。 Fig. 10 is a timing chart showing the transition of the voltage applied to the scanning line and the power supply line during the period in which the EL display device of Fig. 1 is not illuminated, and the transition of the control signal input to the data driver.

第11圖係表示在第2實施形態之EL顯示裝置,被施加於EL元件之順向電壓與流至EL元件之驅動電流之關係的曲線圖。 Fig. 11 is a graph showing the relationship between the forward voltage applied to the EL element and the drive current flowing to the EL element in the EL display device of the second embodiment.

第12圖係以接地電壓為基準,表示被施加於第2實施形態之EL顯示裝置所具備的掃描線、電源線及資料線之電壓之相對關係的電位相關圖。 Fig. 12 is a potential correlation diagram showing the relative relationship between the voltages applied to the scanning lines, the power supply lines, and the data lines of the EL display device of the second embodiment, based on the ground voltage.

第13圖係表示在第2實施形態之EL顯示裝置,被施加於資料線之發光電壓與被施加於資料線之不發光電壓之關係的曲線圖。 Fig. 13 is a graph showing the relationship between the light-emitting voltage applied to the data line and the non-light-emitting voltage applied to the data line in the EL display device of the second embodiment.

第14圖係第2實施形態之EL顯示裝置所具備之像素電路的電路圖,係表示不發光用之寫入操作時之狀態的圖。 Fig. 14 is a circuit diagram of a pixel circuit included in the EL display device of the second embodiment, and is a view showing a state at the time of a write operation for non-light-emitting.

第15圖係第2實施形態之EL顯示裝置所具備之像素電路的電路圖,係表示不發光操作時之狀態的圖。 Fig. 15 is a circuit diagram of a pixel circuit included in the EL display device of the second embodiment, showing a state in which no light is emitted.

第16圖係表示第3實施形態之EL顯示裝置所具備的控制部及選擇驅動器之構成的方塊圖。 Fig. 16 is a block diagram showing the configuration of a control unit and a selection driver included in the EL display device of the third embodiment.

第17圖係表示第3實施形態之EL顯示裝置所具備的資料驅動器及像素電路之構成的方塊圖。 Fig. 17 is a block diagram showing the configuration of a data driver and a pixel circuit included in the EL display device of the third embodiment.

第18圖係與開關之狀態一起表示第3實施形態之EL顯示裝置之在發光期間的控制信號之位準之變遷的時序圖。 Fig. 18 is a timing chart showing the transition of the level of the control signal during the light-emitting period of the EL display device of the third embodiment together with the state of the switch.

第19圖係與開關之狀態一起表示第3實施形態之EL顯示裝置之在不發光期間的控制信號之位準之變遷的時序圖。 Fig. 19 is a timing chart showing the transition of the level of the control signal in the non-light-emitting period of the EL display device of the third embodiment together with the state of the switch.

第20圖係第3實施形態之EL顯示裝置所具備的驅動電晶體之對汲極電流的發光電壓之相依性的曲線圖。 Fig. 20 is a graph showing the dependence of the driving transistor of the EL display device of the third embodiment on the luminescence voltage of the drain current.

第21圖係與開關之狀態一起表示第3實施形態的EL顯示裝置之在檢測動作的控制信號之位準之變遷的時序 圖。 Fig. 21 is a timing chart showing the transition of the level of the control signal of the detection operation of the EL display device of the third embodiment together with the state of the switch. Figure.

第22圖係表示第3實施形態之EL顯示裝置之資料線的電位與緩和時間之關係的曲線圖。 Fig. 22 is a graph showing the relationship between the potential of the data line and the relaxation time of the EL display device of the third embodiment.

第23圖係對從第1列之像素至第540列之像素的每一者表示在第3實施形態之EL顯示裝置之第1個圖框所進行的各動作之時序的模式圖。 Fig. 23 is a schematic diagram showing the timing of each operation performed in the first frame of the EL display device of the third embodiment for each of the pixels from the first column to the 540th column.

第24圖係對從第1列之像素至第540列之像素的每一者表示在第3實施形態之EL顯示裝置之第2個圖框所進行的各動作之時序的模式圖。 Fig. 24 is a schematic diagram showing the timing of each operation performed in the second frame of the EL display device of the third embodiment for each of the pixels from the first column to the 540th column.

第25圖係對從第1列之像素至第540列之像素的每一者表示在第3實施形態之EL顯示裝置之第540個圖框所進行的各動作之時序的模式圖。 Fig. 25 is a schematic diagram showing the timing of each operation performed in the 540th frame of the EL display device of the third embodiment for each of the pixels from the first column to the 540th column.

第26圖係各掃描線及電源線表示在第3實施形態之EL顯示裝置在顯示一個圖框之期間的控制信號之位準之變遷的時序圖。 Fig. 26 is a timing chart showing the transition of the level of the control signal during the display of one frame in the EL display device of the third embodiment.

第27圖係表示在變形例之EL顯示裝置被施加於資料線之發光電壓與被施加於資料線之不發光電壓之關係的曲線圖。 Fig. 27 is a graph showing the relationship between the light-emitting voltage applied to the data line and the non-light-emitting voltage applied to the data line in the EL display device according to the modification.

第28圖係表示在變形例之EL顯示裝置被施加於資料線之發光電壓與被施加於資料線之不發光電壓之關係的曲線圖。 Fig. 28 is a graph showing the relationship between the light-emitting voltage applied to the data line and the non-light-emitting voltage applied to the data line in the EL display device according to the modification.

第29圖係表示變形例之EL顯示裝置之像素電路的電路圖。 Fig. 29 is a circuit diagram showing a pixel circuit of an EL display device according to a modification.

第30圖係在變形例之EL顯示裝置的各圖框之臨限值檢測動作的檢測對象之變遷的示意圖。 Fig. 30 is a view showing the transition of the detection target of the threshold detection operation in each frame of the EL display device according to the modification.

第31圖係在變形例之EL顯示裝置的各圖框之臨限值檢測動作的檢測對象之變遷的示意圖。 Fig. 31 is a schematic diagram showing the transition of the detection target of the threshold detection operation in each frame of the EL display device according to the modification.

第32圖係變形例之EL顯示裝置的各圖框之臨限值檢測動作的檢測對象之變遷的示意圖。 Fig. 32 is a schematic diagram showing the transition of the detection target of the threshold detection operation of each frame of the EL display device according to the modification.

[實施發明之形態] [Formation of the Invention]

參照第1圖~第10圖,說明將在本揭示之EL顯示裝置及EL顯示裝置之驅動方法具體化的第1實施形態。 A first embodiment in which the EL display device and the EL display device driving method of the present disclosure are embodied will be described with reference to Figs. 1 to 10 .

[第1實施形態] [First Embodiment]

參照第1圖,說明EL顯示裝置的整體構成。 The overall configuration of the EL display device will be described with reference to Fig. 1 .

如第1圖所示,顯示面板10所具有之複數個像素Px位於m列×n行之陣列狀。m係1以上之整數,又,n亦係1以上之整數。複數個像素Px之每一者具有包含一個有機EL元件的一個像素電路。 As shown in FIG. 1, the plurality of pixels Px included in the display panel 10 are arranged in an array of m columns x n rows. m is an integer of 1 or more, and n is also an integer of 1 or more. Each of the plurality of pixels Px has a pixel circuit including one organic EL element.

沿著列方向所延伸之m條掃描線Ls、與沿著行方向所延伸之n條資料線Ld係在對顯示面之平面圖上相交叉。複數個像素Px之每一者位於掃描線Ls與資料線Ld之交點附近。沿著列方向所排列之n個像素Px的每一者與一條掃描線Ls及一條電源線La連接。沿著行方向所排列之m個像素Px的每一者與一條資料線Ld連接。 The m scanning lines Ls extending in the column direction and the n data lines Ld extending in the row direction intersect on the plan view of the display surface. Each of the plurality of pixels Px is located near the intersection of the scanning line Ls and the data line Ld. Each of the n pixels Px arranged along the column direction is connected to one scanning line Ls and one power supply line La. Each of the m pixels Px arranged along the row direction is connected to one data line Ld.

m條掃描線Ls之每一者係與選擇驅動器20電性連接。m條電源線La之每一者係與電源驅動器30電性連接。n條資料線Ld之每一者係與資料驅動器40電性連接。各個選擇驅動器20之驅動、電源驅動器30之驅動及資 料驅動器40之驅動係由控制部50所控制。 Each of the m scanning lines Ls is electrically connected to the selection driver 20. Each of the m power lines La is electrically connected to the power source driver 30. Each of the n data lines Ld is electrically connected to the data driver 40. The driving of each selection driver 20, the driving of the power driver 30, and the capital The drive of the material drive 40 is controlled by the control unit 50.

控制部50係以具有中央處理裝置或記憶部之 微電腦為中心所構成。控制部50係從外部接受影像信號後,使用該影像信號來產生各像素Px之顯示資料Din。各像素Px之顯示資料Din,例如是由8位元所構成之灰階資料。控制部50將各像素Px之顯示資料Din輸入至資料驅動器40。 The control unit 50 has a central processing unit or a memory unit. The microcomputer is the center. The control unit 50 receives the video signal from the outside and uses the video signal to generate the display material Din of each pixel Px. The display material Din of each pixel Px is, for example, gray scale data composed of 8-bit elements. The control unit 50 inputs the display material Din of each pixel Px to the data driver 40.

選擇驅動器20具備移位暫存器或緩衝器等。 選擇驅動器20係因應於從控制部50所輸入之控制信號,對各掃描線Ls施加相對基準電壓係高位準之選擇電壓VgH、與相對基準電壓係低位準之非選擇電壓VgL的任一者。選擇驅動器20將被施加選擇電壓VgH之掃描線Ls設定成選擇對象。選擇驅動器20係將選擇對象之候補從第1列之掃描線Ls依序切換至是最後列之第m列的掃描線Ls,並重複這種選擇對象之候補的切換。 The selection driver 20 is provided with a shift register or a buffer. The selection driver 20 applies any one of the selection voltage VgH that is higher than the reference voltage level to the non-selection voltage VgL that is lower than the reference voltage level in each of the scanning lines Ls in response to the control signal input from the control unit 50. The selection driver 20 sets the scanning line Ls to which the selection voltage VgH is applied as the selection target. The selection driver 20 sequentially switches the candidate of the selection target from the scanning line Ls of the first column to the scanning line Ls of the mth column of the last column, and repeats the switching of the candidates of the selection target.

電源驅動器30具備移位暫存器或緩衝器等。 電源驅動器30係因應於從控制部50所輸入之控制信號,對各電源線La施加相對基準電壓係高位準之驅動電壓ELVDD、與係與基準電壓相等之寫入電壓WDVSS的任一者。電源驅動器30將被施加驅動電壓ELVDD之掃描線Ls設定成供給對象。電源驅動器30係將供給對象從第1列之電源線La依序切換至最後列之第m列的電源線La,並重複這種供給對象的切換。此外,電源驅動器30係以在電源驅動器30之供給對象係第k列(k係從1至m的整數)時,選擇驅動器20之選擇對象亦是第k列的方式所構成。 The power driver 30 is provided with a shift register or a buffer. The power source driver 30 applies any one of the driving voltage ELVDD having a higher reference level to the reference voltage and the writing voltage WDVSS equal to the reference voltage to each of the power supply lines La in response to a control signal input from the control unit 50. The power source driver 30 sets the scanning line Ls to which the driving voltage ELVDD is applied as a supply target. The power source driver 30 sequentially switches the supply target from the power supply line La of the first column to the power supply line La of the mth column of the last column, and repeats the switching of the supply target. Further, the power source driver 30 is configured to select the driver 20 to be the kth column when the power source driver 30 is supplied to the kth column (k is an integer from 1 to m).

資料驅動器40係使用顯示資料Din,產生發光 電壓VD或不發光電壓VDN。在控制部50將用以產生發光電壓VD之顯示資料Din輸入至資料驅動器40時,資料驅動器40係使用該顯示資料Din,產生發光電壓VD。在控制部50將用以產生不發光電壓VDN之顯示資料Din輸入至資料驅動器40時,資料驅動器40係使用該顯示資料Din,產生不發光電壓VDN。 The data driver 40 uses the display data Din to generate light. Voltage VD or non-emissive voltage VDN. When the control unit 50 inputs the display data Din for generating the light-emission voltage VD to the data driver 40, the data driver 40 uses the display data Din to generate the light-emission voltage VD. When the control unit 50 inputs the display material Din for generating the non-light-emitting voltage VDN to the data driver 40, the data driver 40 uses the display material Din to generate the non-light-emitting voltage VDN.

資料驅動器40係在發光期間,對各資料線Ld 產生發光電壓VD。資料驅動器40係因應於從控制部50所輸入之控制信號,對n條資料線Ld之每一者,同時施加發光電壓VD。 The data driver 40 is connected to each data line Ld during illumination. A luminescence voltage VD is generated. The data driver 40 applies a light-emission voltage VD to each of the n data lines Ld in response to a control signal input from the control unit 50.

資料驅動器40係在不發光期間,對各資料線 Ld產生不發光電壓VDN。資料驅動器40係因應於從控制部50所輸入之控制信號,對n條資料線Ld之每一者,同時施加不發光電壓VDN。 The data driver 40 is connected to each data line during non-lighting period. Ld produces a non-emissive voltage VDN. The data driver 40 applies a non-light-emitting voltage VDN to each of the n data lines Ld in response to a control signal input from the control unit 50.

[控制部50的構成] [Configuration of Control Unit 50]

參照第2圖,說明控制部50的構成。如第2圖所示,控制部50包括影像信號輸入部51、時序(timing)控制器52、記憶部53、影像信號處理部54及顯示資料輸出部55。 The configuration of the control unit 50 will be described with reference to Fig. 2 . As shown in FIG. 2, the control unit 50 includes a video signal input unit 51, a timing controller 52, a storage unit 53, a video signal processing unit 54, and a display material output unit 55.

影像信號輸入部51係保持被輸入至控制部50之影像信號,並將所保持之影像信號輸出至記憶部53。記憶部53係記憶影像信號輸入部51所輸出之影像信號,並將所記憶之影像信號輸出至影像信號處理部54。顯示資料輸出部55係將影像信號處理部54之處理結果作為顯示資料Din,輸出至資料驅動器40。 The video signal input unit 51 holds the video signal input to the control unit 50, and outputs the held video signal to the storage unit 53. The memory unit 53 stores the video signal output from the video signal input unit 51, and outputs the stored video signal to the video signal processing unit 54. The display data output unit 55 outputs the processing result of the video signal processing unit 54 as the display data Din to the data drive 40.

記憶部53記憶表示發光電壓VD與不發光電 壓VDN之關係的資料。影像信號處理部54係對在一個圖框之各像素Px,使用用以產生發光電壓VD之顯示資料Din、及發光電壓VD與不發光電壓VDN之關係,產生用以產生不發光電壓VDN之顯示資料Din。 The memory unit 53 memorizes the light-emitting voltage VD and the non-light-emitting power Information on the relationship between VDN. The video signal processing unit 54 generates a display for generating the non-light-emitting voltage VDN by using the relationship between the display data Din for generating the light-emission voltage VD and the light-emitting voltage VD and the non-light-emitting voltage VDN for each pixel Px in one frame. Information Din.

時序控制器52控制對記憶部53之影像信號的 寫入時序及對記憶部53之影像信號的讀出時序。時序控制器52控制影像信號處理部54之處理時序。時序控制器52產生資料位移時脈信號Clkd及顯示用位移時脈信號Clks。時序控制器52向資料驅動器40輸出資料位移時脈信號Clkd,並向選擇驅動器20及電源驅動器30輸出顯示用位移時脈信號Clks。 The timing controller 52 controls the image signal to the memory unit 53 The write timing and the read timing of the video signal to the memory unit 53. The timing controller 52 controls the processing timing of the video signal processing unit 54. The timing controller 52 generates a data displacement clock signal Clkd and a display displacement clock signal Clks. The timing controller 52 outputs the data displacement clock signal Clkd to the data driver 40, and outputs the display displacement clock signal Clks to the selection driver 20 and the power source driver 30.

影像信號處理部54係使用從記憶部53所讀出 之影像信號,產生各像素Px之發光用灰階資料。影像信號處理部54係對各像素Px之發光用灰階資料,施加灰階校正(gamma correction)、亮度調整及色度調整。影像信號處理部54係例如使用用以進行各種調整之查表(look up table)與影像信號處理部54所輸入之影像信號,調整各像素Px之發光用灰階資料。影像信號處理部54係在發光期間,將調整後之發光用灰階資料作為顯示資料Din,輸出至顯示資料輸出部55。影像信號處理部54係在不發光期間,另外產生使EL元件不發光之各像素Px的不發光用灰階資料,作為顯示資料Din,並將所產生之顯示資料Din輸出至顯示資料輸出部55。 The video signal processing unit 54 reads out from the storage unit 53. The image signal generates gray scale data for illumination of each pixel Px. The video signal processing unit 54 applies gamma correction, brightness adjustment, and chromaticity adjustment to the gray scale data for light emission of each pixel Px. The video signal processing unit 54 adjusts the gradation data for illumination of each pixel Px by using, for example, a lookup table for performing various adjustments and an image signal input from the video signal processing unit 54. The video signal processing unit 54 outputs the adjusted gray scale data for illumination as the display data Din to the display material output unit 55 during the light emission period. The video signal processing unit 54 generates grayscale data for non-light-emitting pixels of each pixel Px that does not emit light in the EL element, and displays the generated display data Din to the display material output unit 55. .

資料驅動器40係使用在發光期間所輸入之顯 示資料Din,從該顯示資料Din產生發光電壓VD。資料驅動器40係使用在不發光期間所輸入之顯示資料Din,從該顯示資料Din產生不發光電壓VDN。 The data driver 40 is used to display the input during the lighting period. The data Din is displayed, and the illuminating voltage VD is generated from the display data Din. The data driver 40 uses the display material Din input during the non-lighting period to generate a non-light-emitting voltage VDN from the display material Din.

資料位移時脈信號Clkd決定將各像素Px之顯 示資料Din從顯示資料輸出部55輸入至資料驅動器40的時序。資料驅動器40係每當資料位移時脈信號Clkd上升,就按照對應於第1行之像素Px的顯示資料Din、對應於第2行之像素Px的顯示資料Din、…、對應於第n行之像素Px的顯示資料Din的順序,輸入各像素Px之顯示資料Din。資料驅動器40係按照資料位移時脈信號Clkd之時脈週期,將各像素Px之顯示資料Din與該像素Px所連接之資料線Ld賦予對應。 The data shift clock signal Clkd determines the display of each pixel Px The timing at which the data Din is input from the display material output unit 55 to the data driver 40 is shown. The data driver 40 changes the display data Din corresponding to the pixel Px of the first row, the display data Din corresponding to the pixel Px of the second row, and the data corresponding to the nth row every time the data shift clock signal Clkd rises. The order of the display data Din of the pixel Px is input to the display material Din of each pixel Px. The data driver 40 associates the display data Din of each pixel Px with the data line Ld to which the pixel Px is connected in accordance with the clock cycle of the data shift clock signal Clkd.

顯示用位移時脈信號Clks係在發光期間,決 定選擇對象之候補的切換週期及供給對象之候補的切換週期。又,顯示用位移時脈信號Clks係在不發光期間,亦又決定選擇對象之候補的切換週期及供給對象之候補的切換週期。選擇驅動器20係每當顯示用位移時脈信號Clks上升,就按照第1列之掃描線Ls、第2列之掃描線Ls、…、第m列之掃描線Ls的順序,逐條選擇掃描線Ls。 電源驅動器30係每當顯示用位移時脈信號Clks上升,就按照第1列之電源線La、第2列之電源線La、…、第m列之電源線La的順序,逐條選擇電源線La。係顯示用位移時脈信號Clks之時脈週期的顯示用時脈週期係比資料位移時脈信號Clkd之時脈週期更長。例如,顯示用時脈週期係資料位移時脈信號Clkd之時脈週期的n倍。 Displaying the displacement clock signal Clks during the illumination period The switching cycle of the candidate of the selection target and the switching cycle of the candidate of the supply target. Further, the display displacement clock signal Clks is determined not to be in the non-light-emitting period, but also to determine the switching cycle of the candidate to be selected and the switching cycle of the candidate to be supplied. The selection driver 20 selects the scanning lines one by one in the order of the scanning line Ls of the first column, the scanning line Ls of the second column, the scanning line Ls of the second column, and the scanning line Ls of the mth column, each time the selection drive pulse signal Clks rises. Ls. The power driver 30 selects the power line one by one in the order of the power line La of the first column, the power line La of the second column, the power line La of the second column, and the power line La of the mth column, each time the display displacement pulse signal Clks rises. La. It is shown that the clock period for displaying the clock period of the displacement clock signal Clks is longer than the clock period of the data shift clock signal Clkd. For example, the display clock cycle is n times the clock period of the data shift clock signal Clkd.

時序控制器52產生起動脈衝信號SP1、起動脈 衝信號SP2及鎖存脈衝信號LP。時序控制器52將起動脈衝信號SP1及鎖存脈衝信號LP輸入至資料驅動器40。時序控制器52將起動脈衝信號SP2輸入至選擇驅動器20及電源驅動器30。 The timing controller 52 generates a start pulse signal SP1 and an artery The signal SP2 and the latch pulse signal LP. The timing controller 52 inputs the start pulse signal SP1 and the latch pulse signal LP to the data driver 40. The timing controller 52 inputs the start pulse signal SP2 to the selection driver 20 and the power source driver 30.

起動脈衝信號SP1係控制資料驅動器40之處 理時序的控制信號,控制將一列份之顯示資料Din從顯示資料輸出部55輸入至資料驅動器40的時序。資料驅動器40係每當輸入起動脈衝信號SP1,就從與m列第1行之像素Px對應的顯示資料Din至與m列第n行之像素Px對應的顯示資料Din僅取入一列份之各像素Px的顯示資料Din。 The start pulse signal SP1 controls the data driver 40 The timing control signal controls the timing at which the display data Din of one column is input from the display material output unit 55 to the data driver 40. Each time the data driver 40 inputs the start pulse signal SP1, only the display data Din corresponding to the pixel Px of the first row of the m column and the display data Din corresponding to the pixel Px of the nth row of the m column are taken into each of the columns. The display data Din of the pixel Px.

鎖存脈衝信號LP係控制資料驅動器40之處 理時序的控制信號,控制使資料驅動器40保持一列份之顯示資料Din的時序。資料驅動器40係每當輸入鎖存脈衝信號LP,就從與m列第1行之像素Px對應的顯示資料Din至與m列第n行之像素Px對應的顯示資料Din保持一列份之顯示資料Din。 The latch pulse signal LP controls the data driver 40 The timing control signal controls the data driver 40 to maintain a sequence of display data Din. The data driver 40 maintains one column of display data from the display data Din corresponding to the pixel Px of the first row of the m column to the display data Din corresponding to the pixel Px of the nth row of the m column, every time the latch pulse signal LP is input. Din.

起動脈衝信號SP2係控制選擇驅動器20之處 理時序的控制信號,每當切換選擇對象之候補m次,控制選擇對象之候補的切換之開始時序。起動脈衝信號SP2係控制電源驅動器30之處理時序的控制信號,每當切換供給對象之候補m次,控制供給對象之候補的切換之開始時序。選擇驅動器20係每當輸入起動脈衝信號SP2,作為選擇對象之候補,從第1列之掃描線Ls依序切換至第m列之掃描線Ls。電源驅動器30係每當輸入起動脈衝信號 SP2,作為供給對象之候補,從第1列之電源線La依序切換至第m列之電源線La。 The start pulse signal SP2 controls where the drive 20 is selected The control signal of the timing is controlled every time the candidate of the selection target is switched m times, and the start timing of the switching of the candidates of the selection target is controlled. The start pulse signal SP2 is a control signal for controlling the processing timing of the power source driver 30, and controls the start timing of the switching of the candidate to be supplied every time the candidate of the supply target is switched m times. The selection driver 20 sequentially switches the scanning line Ls of the first column to the scanning line Ls of the m-th column every time the start pulse signal SP2 is input as a candidate for selection. The power driver 30 is required to input a start pulse signal every time. SP2, as a candidate for supply, sequentially switches from the power supply line La of the first column to the power supply line La of the mth column.

[選擇驅動器20的構成] [Structure of Selecting Driver 20]

參照第2圖,說明選擇驅動器20的構成。此外,在電源驅動器30之選擇供給對象之候補的構成係與在選擇驅動器20之選擇選擇對象之候補的構成相同。因此,在以下,詳細說明選擇驅動器20的構成,而對電源驅動器30的構成省略說明。 The configuration of the selection driver 20 will be described with reference to Fig. 2 . Further, the configuration of the candidate for selection of the power source driver 30 is the same as the configuration of the candidate for selection and selection of the selection driver 20. Therefore, the configuration of the selection driver 20 will be described in detail below, and the description of the configuration of the power source driver 30 will be omitted.

如第2圖所示,控制部50將起動脈衝信號SP2及顯示用位移時脈信號Clks輸入至移位暫存器電路21。移位暫存器電路21係對每輸入起動脈衝信號SP2,產生包含一個選擇對象位元之m位元的並列信號,並將該並列信號作為位移信號輸出。移位暫存器電路21係對每輸入顯示用位移時脈信號Clks,就使在位移信號之一個選擇對象位元從與第1列之像素Px對應的位置至與第m列之像素Px對應的位置,依序逐次位移一列份的像素Px。 As shown in FIG. 2, the control unit 50 inputs the start pulse signal SP2 and the display displacement clock signal Clks to the shift register circuit 21. The shift register circuit 21 generates a parallel signal including m bits of one selected object bit for each input start pulse signal SP2, and outputs the parallel signal as a displacement signal. The shift register circuit 21 pairs each of the display displacement pulse signals Clks so that one of the selection target bits of the displacement signal corresponds from the position corresponding to the pixel Px of the first column to the pixel Px of the mth column. The position is sequentially shifted by one column of pixels Px.

移位暫存器電路21將位移信號輸入至位準位移器電路22。位準位移器電路22係連接低耐壓電路與高耐壓電路之電壓調整電路,將位移信號之電壓調整至緩衝電路23的驅動位準。位準位移器電路22將緩衝電路23之驅動位準的位移信號輸入至緩衝電路23。緩衝電路23將位移信號之電壓調整至像素Px的驅動位準。 The shift register circuit 21 inputs the displacement signal to the level shifter circuit 22. The level shifter circuit 22 is connected to a voltage regulating circuit of a low withstand voltage circuit and a high withstand voltage circuit, and adjusts the voltage of the displacement signal to the driving level of the buffer circuit 23. The level shifter circuit 22 inputs the displacement signal of the driving level of the buffer circuit 23 to the buffer circuit 23. The buffer circuit 23 adjusts the voltage of the displacement signal to the driving level of the pixel Px.

[資料驅動器40的構成] [Configuration of Data Driver 40]

參照第3圖,說明資料驅動器40的構成。 The configuration of the data drive 40 will be described with reference to Fig. 3.

如第3圖所示,資料驅動器40具備移位暫存器電路41 、資料暫存器電路42、資料鎖存電路43、電壓變換電路44及緩衝電路45。移位暫存器電路41、資料暫存器電路42及資料鎖存電路43係作為低耐壓電路所構成,邏輯電源60將高位準之邏輯電源電壓LVDD及低位準之邏輯基準電壓LVSS施加於這些電路。電壓變換電路44及緩衝電路45係作為高耐壓電路所構成,類比電源70將高位準之類比電源電壓DVSS及低位準之類比基準電壓VEE施加於這些電路。類比電源電壓DVSS被設定成與寫入電壓WDVSS及基準電壓ELVSS相等的位準。 As shown in FIG. 3, the data driver 40 is provided with a shift register circuit 41. The data register circuit 42, the data latch circuit 43, the voltage conversion circuit 44, and the buffer circuit 45. The shift register circuit 41, the data register circuit 42, and the data latch circuit 43 are formed as low-voltage circuits, and the logic power supply 60 applies a high-level logic supply voltage LVDD and a low-level logic reference voltage LVSS. These circuits. The voltage conversion circuit 44 and the buffer circuit 45 are configured as a high withstand voltage circuit, and the analog power supply 70 applies a high level analog power supply voltage DVSS and a low level reference voltage VEE to these circuits. The analog power supply voltage DVSS is set to a level equal to the write voltage WDVSS and the reference voltage ELVSS.

控制部50將起動脈衝信號SP1與資料位移時 脈信號Clkd輸入至移位暫存器電路41。移位暫存器電路41係對每輸入起動脈衝信號SP1,產生包含一個選擇對象位元之n位元的並列信號,並將該並列信號作為位移信號輸出。移位暫存器電路41係每當輸入資料位移時脈信號Clkd,使在位移信號之一個選擇對象位元依序位移並輸出。 When the control unit 50 shifts the start pulse signal SP1 and the data The pulse signal Clkd is input to the shift register circuit 41. The shift register circuit 41 generates a parallel signal including n bits of one selected object bit for each input start pulse signal SP1, and outputs the parallel signal as a displacement signal. The shift register circuit 41 shifts the clock signal Clkd every time the input data is shifted, so that a selected object bit of the displacement signal is sequentially shifted and output.

控制部50將顯示資料Din輸入至資料暫存器 電路42。顯示資料Din例如是由8位元所構成之灰階資料。資料暫存器電路42具備被與位移信號之各位元賦予對應的n個暫存器,一個暫存器取入各像素Px之顯示資料Din。資料暫存器電路42係每次將各像素Px之顯示資料Din輸入藉一個選擇對象位元所選擇之一個暫存器。資料暫存器電路42係藉一個選擇對象位元之位移選擇全部的暫存器,而將一列份之顯示資料Din取入n個暫存器。 The control unit 50 inputs the display data Din to the data register Circuit 42. The display material Din is, for example, gray scale data composed of 8-bit elements. The data register circuit 42 includes n register memories corresponding to the bits of the shift signal, and one register takes in the display data Din of each pixel Px. The data register circuit 42 inputs the display data Din of each pixel Px to a register selected by a selection target bit each time. The data register circuit 42 selects all the registers by the displacement of one selected object bit, and takes a column of the display data Din into the n registers.

控制部50將鎖存脈衝信號LP輸入至資料鎖 存電路43。資料鎖存電路43具備被與資料暫存器電路42之各暫存器賦予對應的n個資料鎖存器43a。n個資料鎖存器43a之每一者係對資料暫存器電路42,與彼此相異的暫存器電性連接。n個資料鎖存器43a之每一者保持係連接對象之暫存器所記憶的顯示資料Din,並對各鎖存脈衝信號LP重複該保持。n個資料鎖存器43a之每一者將所保持之顯示資料Din輸入至電壓變換電路44。資料鎖存電路43係每當輸入鎖存脈衝信號LP,保持資料暫存器電路42所取入之一列份的顯示資料Din,並將所保持之一列份的顯示資料Din輸入至電壓變換電路44。 The control unit 50 inputs the latch pulse signal LP to the data lock The circuit 43 is stored. The data latch circuit 43 includes n material latches 43a that are associated with the respective registers of the data register circuit 42. Each of the n data latches 43a is coupled to the data register circuit 42 and electrically connected to mutually different registers. Each of the n data latches 43a holds the display material Din memorized by the register connected to the object, and repeats the hold for each latch pulse signal LP. Each of the n data latches 43a inputs the held display data Din to the voltage conversion circuit 44. The data latch circuit 43 holds the display data Din of one of the columns taken in by the data register circuit 42 every time the latch pulse signal LP is input, and inputs the display data Din of one of the columns to the voltage conversion circuit 44. .

電壓變換電路44具備係線性電壓數位-類比 變換電路之n個顯示用DAC44a。n個顯示用DAC44a之每一者係對資料鎖存電路43,經由不同之位準位移器46a,與彼此相異之資料鎖存器43a電性連接。n個顯示用DAC44a之每一者將係連接對象之資料鎖存器43a所保持的顯示資料Din變換成類比電壓。顯示用DAC44a係所輸出之類比電壓對所輸入的數位資料具有線性。藉顯示用DAC44a所變換之類比電壓被設定成位於從類比電源70所施加之類比電源電壓DVSS與類比基準電壓VEE之間。 Voltage conversion circuit 44 is provided with a linear voltage digital-analog The n display DACs 44a of the conversion circuit. Each of the n display DACs 44a is connected to the data latch circuit 43 via a different level shifter 46a, and is electrically connected to the data latch 43a different from each other. Each of the n display DACs 44a converts the display data Din held by the data latch 43a of the connection object into an analog voltage. The analog voltage output by the display DAC44a is linear to the input digital data. The analog voltage converted by the display DAC 44a is set to be between the analog supply voltage DVSS and the analog reference voltage VEE applied from the analog power supply 70.

緩衝電路45具備n個緩衝器45a。n個緩衝器 45a之每一者係對電壓變換電路44,與彼此相異之顯示用DAC44a電性連接。又,n個緩衝器45a之每一者係與彼此相異之資料線Ld電性連接。n個緩衝器45a之每一者將在係連接對象之顯示用DAC44a所產生的類比電壓放大至像素電路的驅動位準。n個緩衝器45a之每一者係在發光 期間,產生與各像素Px之顯示資料Din對應的發光電壓VD。又,n個緩衝器45a之每一者係在不發光期間,產生與各像素Px之顯示資料Din對應的不發光電壓VDN。 The buffer circuit 45 is provided with n buffers 45a. n buffers Each of 45a is connected to the voltage conversion circuit 44, and is electrically connected to the display DAC 44a different from each other. Further, each of the n buffers 45a is electrically connected to the data lines Ld different from each other. Each of the n buffers 45a amplifies the analog voltage generated by the display DAC 44a of the connection target to the driving level of the pixel circuit. Each of the n buffers 45a is illuminated During this period, a light-emission voltage VD corresponding to the display material Din of each pixel Px is generated. Further, each of the n buffers 45a generates a non-light-emitting voltage VDN corresponding to the display material Din of each pixel Px during the non-light-emitting period.

[驅動電路PCC的構成] [Configuration of Drive Circuit PCC]

參照第3圖,說明驅動電路PCC的構成。 The configuration of the drive circuit PCC will be described with reference to Fig. 3 .

如第3圖所示,像素Px包括EL元件11與使EL元件11發光之驅動電路PCC。驅動電路PCC包括3個電晶體Tr1~Tr3與保持電容Cs。電晶體Tr1~Tr3係n通道型之電晶體。 As shown in FIG. 3, the pixel Px includes an EL element 11 and a driving circuit PCC that causes the EL element 11 to emit light. The drive circuit PCC includes three transistors Tr1 to Tr3 and a holding capacitor Cs. The transistors Tr1 to Tr3 are n-channel type transistors.

在取樣電晶體Tr1,源極係與資料線Ld電性連接,汲極係與EL元件11之陽極電性連接,閘極係與掃描線Ls電性連接。在選擇電壓VgH被施加於掃描線Ls時,取樣電晶體Tr1成為導通狀態。另一方面,在非選擇電壓VgL被施加於掃描線Ls時,取樣電晶體Tr1成為非導通狀態。 In the sampling transistor Tr1, the source is electrically connected to the data line Ld, the drain is electrically connected to the anode of the EL element 11, and the gate is electrically connected to the scanning line Ls. When the selection voltage VgH is applied to the scanning line Ls, the sampling transistor Tr1 is turned on. On the other hand, when the non-selection voltage VgL is applied to the scanning line Ls, the sampling transistor Tr1 is in a non-conduction state.

在切換電晶體Tr2,源極係與驅動電晶體Tr3之閘極電性連接,汲極係與電源線La電性連接,閘極係與取樣電晶體Tr1之閘極電性連接。在選擇電壓VgH被施加於掃描線Ls時,切換電晶體Tr2成為導通狀態。另一方面,在非選擇電壓VgL被施加於掃描線Ls時,切換電晶體Tr2成為非導通狀態。 In the switching transistor Tr2, the source is electrically connected to the gate of the driving transistor Tr3, the drain is electrically connected to the power line La, and the gate is electrically connected to the gate of the sampling transistor Tr1. When the selection voltage VgH is applied to the scanning line Ls, the switching transistor Tr2 is turned on. On the other hand, when the non-selection voltage VgL is applied to the scanning line Ls, the switching transistor Tr2 is turned off.

在驅動電晶體Tr3,是連接端之一例的源極係與EL元件11之陽極電性連接,是供電端之一例的汲極係與切換電晶體Tr2之汲極電性連接,閘極係與切換電晶體Tr2之源極電性連接。 In the driving transistor Tr3, the source of one of the connection terminals is electrically connected to the anode of the EL element 11, and the gate of one of the power supply terminals is electrically connected to the gate of the switching transistor Tr2, and the gate is connected. The source of the switching transistor Tr2 is electrically connected.

保持電容Cs將驅動電晶體Tr3之閘極與源極 之間電性連接。保持電容Cs亦可係形成於驅動電晶體Tr3之閘極與源極之間的寄生電容,亦可將其他的電容元件與寄生電容並聯。 The holding capacitor Cs will drive the gate and source of the transistor Tr3 Electrical connection between them. The holding capacitor Cs may also be a parasitic capacitance formed between the gate and the source of the driving transistor Tr3, and may also connect other capacitive elements in parallel with the parasitic capacitance.

EL元件11之陰極係與是基準電壓線一例的 接地電壓線Lb電性連接。接地電壓線Lb被設定成基準電壓ELVSS,基準電壓ELVSS係對類比基準電壓VEE是高位準,係與類比電源電壓DVSS相等的位準。此外,在像素Px,在EL元件11包含像素電容Ce,並在資料線Ld包含寄生電容Cp。 The cathode system of the EL element 11 and an example of a reference voltage line The ground voltage line Lb is electrically connected. The ground voltage line Lb is set to the reference voltage ELVSS, and the reference voltage ELVSS is at a high level to the analog reference voltage VEE and is equal to the level of the analog power supply voltage DVSS. Further, in the pixel Px, the pixel capacitance Ce is included in the EL element 11, and the parasitic capacitance Cp is included in the data line Ld.

[不發光電壓VDN] [No illuminating voltage VDN]

參照第4圖,說明發光電壓VD與不發光電壓VDN之關係。第4圖係表示影像信號處理部54所賦予對應的發光電壓VD與不發光電壓VDN之關係的曲線圖。 Referring to Fig. 4, the relationship between the light-emission voltage VD and the non-light-emitting voltage VDN will be described. Fig. 4 is a graph showing the relationship between the corresponding light-emission voltage VD and the non-light-emitting voltage VDN given by the video signal processing unit 54.

如第4圖所示,不發光電壓VDN係被與發光電壓VD賦予對應。在將基準電壓ELVSS及寫入電壓WDVSS設為0V、並將驅動電壓ELVDD之極性設為正時,發光電壓VD之極性與不發光電壓VDN之極性係都是負。不發光電壓VDN係其被賦予對應之發光電壓VD愈高時愈低。 As shown in FIG. 4, the non-light-emitting voltage VDN is associated with the light-emission voltage VD. When the reference voltage ELVSS and the write voltage WDVSS are set to 0 V and the polarity of the drive voltage ELVDD is set to be positive, the polarity of the light-emission voltage VD and the polarity of the non-light-emitting voltage VDN are both negative. The non-light-emitting voltage VDN is lower as the corresponding light-emitting voltage VD is given higher.

例如,在發光電壓VD是-10V時,作為不發光電壓VDN,0V被賦予對應,而在發光電壓VD是-8V時,作為不發光電壓VDN,-2V被賦予對應。NK,在發光電壓VD是0V時,作為不發光電壓VDN,-10V被賦予對應。 For example, when the light-emission voltage VD is -10 V, 0 V is given as the non-light-emitting voltage VDN, and when the light-emission voltage VD is -8 V, the non-light-emitting voltage VDN, -2 V is given a correspondence. NK, when the illuminating voltage VD is 0 V, is assigned as a non-light-emitting voltage VDN, -10 V.

在發光電壓VD之設定的範圍,-5V是中間值,不發光電壓VDN係將中間值作為基準,與發光電壓VD 對稱之反轉電壓。此外,發光電壓VD之設定的範圍係配合基準電壓、寫入電壓WDVSS、驅動電壓ELVDD及EL元件11之驅動適當地設定,亦可是從0V至-10V以外。 In the range in which the light-emitting voltage VD is set, -5V is an intermediate value, and the non-light-emitting voltage VDN is an intermediate value as a reference, and a light-emitting voltage VD Symmetrical reverse voltage. Further, the range in which the light-emission voltage VD is set is appropriately set in accordance with the reference voltage, the write voltage WDVSS, the drive voltage ELVDD, and the driving of the EL element 11, and may be other than 0V to -10V.

而且,控制部50係以對在一個圖框之各像素 Px,產生用以產生發光電壓VD之顯示資料Din、與成為該發光電壓VD的反轉電壓之用以產生不發光電壓VDN之顯示資料Din的方式所構成。例如,控制部50之影像信號處理部54具備用以產生發光電壓VD之顯示資料Din(發光用灰階資料)與顯示資料Din的最高階臨限值之差分值的差分電路。而且,控制部50之影像信號處理部54係每當產生用以產生發光電壓VD之顯示資料Din,將該顯示資料Din應用於差分電路,產生用以產生不發光電壓VDN之顯示資料Din(不發光用灰階資料)。 Moreover, the control unit 50 is configured to face each pixel in one frame. Px is configured to generate display data Din for generating the light-emission voltage VD and display data Din for generating the non-light-emitting voltage VDN which is the inverted voltage of the light-emitting voltage VD. For example, the video signal processing unit 54 of the control unit 50 includes a difference circuit for generating a difference value between the display data Din (light-emitting gray scale data) of the light-emission voltage VD and the highest-order threshold value of the display data Din. Further, the video signal processing unit 54 of the control unit 50 generates the display data Din for generating the light-emission voltage VD, applies the display data Din to the differential circuit, and generates display data Din for generating the non-light-emitting voltage VDN (not Gray scale data for lighting).

參照第5圖至第8圖,說明被施加發光電壓VD 與不發光電壓VDN之驅動電路PCC的作用。 Referring to Figures 5 to 8, the applied illuminating voltage VD will be described. The function of the driving circuit PCC with the non-lighting voltage VDN.

如第5圖所示,在電源線La被施加寫入電壓WDVSS、掃描線Ls被施加選擇電壓VgH時,取樣電晶體Tr1及切換電晶體Tr2係導通狀態。在取樣電晶體Tr1及切換電晶體Tr2係導通狀態時,驅動電晶體Tr3係在飽和區域驅動。在此狀態,資料線Ld被施加發光電壓VD時,因應於電源線La之電壓與資料線Ld之電壓之電位差的寫入電壓作為驅動電晶體Tr3之閘極-源極間電壓Vgs,被保持電容Cs所保持。 As shown in FIG. 5, when the write voltage WDVSS is applied to the power supply line La and the selection voltage VgH is applied to the scanning line Ls, the sampling transistor Tr1 and the switching transistor Tr2 are turned on. When the sampling transistor Tr1 and the switching transistor Tr2 are in an on state, the driving transistor Tr3 is driven in the saturation region. In this state, when the light-emitting voltage VD is applied to the data line Ld, the write voltage corresponding to the potential difference between the voltage of the power supply line La and the voltage of the data line Ld is held as the gate-source voltage Vgs of the driving transistor Tr3. The capacitor Cs is maintained.

在此時,因為發光電壓VD係比基準電壓 ELVSS更低位準,所以在EL元件11,被施加EL元件11之 逆向電壓。又,因為發光電壓VD係比寫入電壓WDVSS更低位準,所以在驅動電晶體Tr3流動之電流Ie係不會向EL元件11流動,而朝向資料線Ld被拉入。 At this time, because the illuminating voltage VD is higher than the reference voltage ELVSS is lower level, so in the EL element 11, the EL element 11 is applied. Reverse voltage. Further, since the light-emission voltage VD is lower than the write voltage WDVSS, the current Ie flowing through the drive transistor Tr3 does not flow to the EL element 11, but is drawn toward the data line Ld.

如第6圖所示,在發光用之寫入電壓被保持電 容Cs保持的狀態,非選擇電壓VgL被施加於掃描線Ls時,取樣電晶體Tr1及切換電晶體Tr2係非導通狀態。在此狀態,驅動電壓ELVDD被施加於電源線La時,因為驅動電壓ELVDD係比基準電壓ELVSS更高位準,所以驅動電晶體Tr3係使因應於閘極-源極間電壓Vgs之汲極電流流至EL元件11。在此時,在驅動電晶體Tr3之汲極電流係在其飽和區域,因應於閘極-源極間電壓Vgs與在驅動電晶體Tr3之臨限值電壓Vth的差而變。結果,因應於保持電容Cs所保持之寫入電壓與在驅動電晶體Tr3之臨限值電壓Vth的差之汲極電流流至EL元件11。 As shown in Figure 6, the write voltage for illumination is kept charged. When the capacitance Cs is maintained, when the non-selection voltage VgL is applied to the scanning line Ls, the sampling transistor Tr1 and the switching transistor Tr2 are in a non-conduction state. In this state, when the driving voltage ELVDD is applied to the power supply line La, since the driving voltage ELVDD is higher than the reference voltage ELVSS, the driving transistor Tr3 is caused to flow in accordance with the gate-source voltage Vgs. To the EL element 11. At this time, the drain current of the driving transistor Tr3 is in the saturation region thereof, and is varied in accordance with the difference between the gate-source voltage Vgs and the threshold voltage Vth of the driving transistor Tr3. As a result, the drain current flows to the EL element 11 in response to the difference between the write voltage held by the holding capacitor Cs and the threshold voltage Vth of the driving transistor Tr3.

如第7圖所示,在電源線La被施加寫入電壓 WDVSS、掃描線Ls被施加選擇電壓VgH時,取樣電晶體Tr1及切換電晶體Tr2係導通狀態。在取樣電晶體Tr1及切換電晶體Tr2係導通狀態時,驅動電晶體Tr3係在飽和區域驅動。在此狀態,資料線Ld被施加不發光電壓VDN時,因應於電源線La之電壓與資料線Ld之電壓之電位差的寫入電壓作為驅動電晶體Tr3之閘極-源極間電壓Vgs,被保持電容Cs所保持。 As shown in Figure 7, a write voltage is applied to the power line La. When the selection voltage VgH is applied to the WDVSS and the scanning line Ls, the sampling transistor Tr1 and the switching transistor Tr2 are turned on. When the sampling transistor Tr1 and the switching transistor Tr2 are in an on state, the driving transistor Tr3 is driven in the saturation region. In this state, when the data line Ld is applied with the non-light-emitting voltage VDN, the write voltage corresponding to the potential difference between the voltage of the power supply line La and the voltage of the data line Ld is used as the gate-source voltage Vgs of the driving transistor Tr3. The holding capacitor Cs is held.

在此時,因為不發光電壓VDN係比基準電壓 ELVSS更低位準,所以在EL元件11,被施加EL元件11之逆向電壓。又,因為不發光電壓VDN係比寫入電壓 WDVSS更低位準,所以在驅動電晶體Tr3流動之電流Iue係不會向EL元件11流動,而朝向資料線Ld被拉入。 At this time, because the non-emissive voltage VDN is higher than the reference voltage ELVSS is lower level, so in the EL element 11, the reverse voltage of the EL element 11 is applied. Also, because the non-emissive voltage VDN is higher than the write voltage Since WDVSS is lower, the current Iue flowing through the driving transistor Tr3 does not flow to the EL element 11, but is pulled in toward the data line Ld.

在此,在EL顯示裝置所具備之複數個像素Px 的每一者,在顯示影像之期間,被重複施加發光電壓VD。而且,因為具有單一極性之發光電壓VD的施加在驅動電晶體Tr3之閘極-源極間重複,所以在驅動電晶體Tr3中,進行閘極-源極間之臨限值電壓的位移。而且,因為不發光電壓VDN亦具有與發光電壓VD相同之極性,所以藉這種不發光電壓VDN之施加,亦進行臨限值電壓的位移。在此時,因為不發光電壓VDN係發光電壓VD之反轉電壓,所以驅動電晶體Tr3之閘極-源極間電壓Vgs係前面之發光電壓VD愈高時愈低。因此,在複數個像素Px之每一者,藉發光電壓VD之施加所造成的位移愈大,藉不發光電壓VDN之施加所造成的位移愈小;相反地,藉發光電壓VD之施加所造成的位移愈小,藉不發光電壓VDN之施加所造成的位移愈大。結果,在發光電壓VD彼此相異之複數個像素Px,可使臨限值電壓之位移均一化。 Here, the plurality of pixels Px included in the EL display device Each of them is repeatedly applied with the illuminating voltage VD during the display of the image. Further, since the application of the illuminating voltage VD having a single polarity is repeated between the gate and the source of the driving transistor Tr3, the displacement of the threshold voltage between the gate and the source is performed in the driving transistor Tr3. Further, since the non-light-emitting voltage VDN also has the same polarity as the light-emission voltage VD, the displacement of the threshold voltage is also performed by the application of the non-light-emitting voltage VDN. At this time, since the non-light-emitting voltage VDN is the inverted voltage of the light-emission voltage VD, the lower the gate-source voltage Vgs of the drive transistor Tr3 is, the higher the light-emitting voltage VD is. Therefore, in each of the plurality of pixels Px, the larger the displacement caused by the application of the illuminating voltage VD, the smaller the displacement caused by the application of the illuminating voltage VDN; conversely, the application of the illuminating voltage VD The smaller the displacement, the greater the displacement caused by the application of the non-illuminating voltage VDN. As a result, in the plurality of pixels Px whose emission voltages VD are different from each other, the displacement of the threshold voltage can be made uniform.

如第8圖所示,在不發光用之寫入電壓被保持 電容Cs保持的狀態,非選擇電壓VgL被施加於掃描線Ls時,取樣電晶體Tr1及切換電晶體Tr2係非導通狀態。在此狀態,寫入電壓WDVSS被持續施加於電源線La時,與上述之寫入相同,電流不流至驅動電晶體Tr3。又,因為在寫入動作後之驅動電晶體Tr3的源極係比基準電壓ELVSS更低位準,所以逆向電壓被持續施加於EL元件11。 As shown in Figure 8, the write voltage for non-illumination is maintained. When the capacitor Cs is held, when the non-selection voltage VgL is applied to the scanning line Ls, the sampling transistor Tr1 and the switching transistor Tr2 are in a non-conduction state. In this state, when the write voltage WDVSS is continuously applied to the power supply line La, the current does not flow to the drive transistor Tr3 as in the above-described write. Further, since the source of the driving transistor Tr3 after the writing operation is lower than the reference voltage ELVSS, the reverse voltage is continuously applied to the EL element 11.

[EL顯示裝置之作用] [The role of EL display device]

參照第9圖及第10圖,說明EL顯示裝置之發光期間的動作、及EL顯示裝置之不發光期間的動作。首先,說明EL顯示裝置之發光期間的動作。 The operation of the EL display device during the light-emitting period and the operation of the EL display device during the non-light-emitting period will be described with reference to FIGS. 9 and 10. First, the operation during the light emission period of the EL display device will be described.

如第9圖所示,在時序td1,控制部50將起動脈衝信號SP1輸入至資料驅動器40。藉此,移位暫存器電路41將位移信號輸入資料暫存器電路42,而資料暫存器電路42取入第1列之顯示資料Din。然後,控制部50將起動脈衝信號SP2輸入至選擇驅動器20及電源驅動器30。 As shown in FIG. 9, at timing td1, the control unit 50 inputs the start pulse signal SP1 to the data driver 40. Thereby, the shift register circuit 41 inputs the shift signal into the data register circuit 42, and the data register circuit 42 takes in the display data Din of the first column. Then, the control unit 50 inputs the start pulse signal SP2 to the selection driver 20 and the power source driver 30.

在時序td2,控制部50將選擇電壓VgH施加於第1列之掃描線Ls,使第1列之各取樣電晶體Tr1與第1列之各切換電晶體Tr2變成導通狀態。又,控制部50將鎖存脈衝信號LP輸入至資料驅動器40,藉此,使各資料鎖存器43a保持第1列之顯示資料Din。n個資料鎖存器43a所保持之第1列的顯示資料Din係經由n個位準位移器46a,藉n個顯示用DAC44a變換成類比電壓後,作為發光電壓VD,施加於各資料線Ld。 At the timing td2, the control unit 50 applies the selection voltage VgH to the scanning line Ls of the first column, and turns the sampling transistors Tr1 of the first column and the switching transistors Tr2 of the first column into an ON state. Moreover, the control unit 50 inputs the latch pulse signal LP to the data driver 40, whereby each of the material latches 43a holds the display data Din of the first column. The display data Din of the first column held by the n data latches 43a is converted into an analog voltage by the n display DACs 44a via the n level shifters 46a, and is applied to the respective data lines Ld as the light-emission voltage VD. .

另一方面,控制部50對第1列之電源線La持續施加寫入電壓WDVSS。結果,第1列之各驅動電晶體Tr3的閘極-源極間電壓Vgs成為因應於寫入電壓WDVSS與發光電壓VD之差的值,並作為寫入電壓,由保持電容Cs所保持。藉此,控制部50係對第1列之各像素Px,使保持驅動電晶體Tr3之成為順向的閘極-源極間電壓Vgs,而將第1列之各驅動電晶體Tr3設為可在飽和區域驅動之狀態後,結束對第1列之各像素Px之發光用的寫入操作。 On the other hand, the control unit 50 continuously applies the write voltage WDVSS to the power line La of the first column. As a result, the gate-source voltage Vgs of each of the driving transistors Tr3 in the first column is a value corresponding to the difference between the address voltage WDVSS and the light-emission voltage VD, and is held as a write voltage by the holding capacitor Cs. Thereby, the control unit 50 sets the gate-source voltage Vgs in the forward direction in which the driving transistor Tr3 is held for each pixel Px in the first column, and makes each of the driving transistors Tr3 in the first column configurable. After the state of the saturation region is driven, the writing operation for light emission of each pixel Px of the first column is ended.

此外,在此期間,控制部50將起動脈衝信號 SP1再輸入至資料驅動器40。藉此,移位暫存器電路41將位移信號輸入至資料暫存器電路42,而從控制部50取入第2列之顯示資料Din。 In addition, during this period, the control unit 50 will start the pulse signal. SP1 is again input to the data drive 40. Thereby, the shift register circuit 41 inputs the shift signal to the data register circuit 42, and the display unit Din of the second column is taken in from the control unit 50.

在時序td3,控制部50將非選擇電壓VgL施加 於第1列之掃描線Ls,使第1列之各取樣電晶體Tr1與第1列之各切換電晶體Tr2變成非導通狀態。又,控制部50將驅動電壓ELVDD施加於第1列之電源線La。結果,第1列之各驅動電晶體Tr3將因應於第1列之保持電容Cs所保持的寫入電壓與在其所連接之驅動電晶體Tr3的臨限值電壓Vth之差的汲極電流供給至對應的EL元件11。藉此,控制部50使對第1列之各像素Px的發光操作開始。 At timing td3, the control section 50 applies the non-selection voltage VgL. In the scanning line Ls of the first column, each of the sampling transistors Tr1 of the first column and the switching transistors Tr2 of the first column are brought into a non-conduction state. Moreover, the control unit 50 applies the driving voltage ELVDD to the power supply line La of the first column. As a result, each of the driving transistors Tr3 of the first column supplies the drain current of the difference between the writing voltage held by the holding capacitor Cs of the first column and the threshold voltage Vth of the driving transistor Tr3 to which it is connected. To the corresponding EL element 11. Thereby, the control unit 50 starts the light-emitting operation for each pixel Px of the first column.

此外,在此期間,控制部50將選擇電壓VgH 施加於第2列之掃描線Ls,而且將寫入電壓WDVSS施加於第2列之電源線La,而使第2列之各取樣電晶體Tr1與第2列之各切換電晶體Tr2變成導通狀態。又,控制部50係再將鎖存脈衝信號LP輸入至資料驅動器40,使各資料鎖存器43a保持第2列之顯示資料Din。各資料鎖存器43a所保持之第2列的顯示資料Din係經由位準位移器46a,藉顯示用DAC44a變換成類比電壓後,作為發光電壓VD,被輸入至資料線Ld。然後,第2列之各驅動電晶體Tr3的閘極-源極間電壓Vgs成為因應於寫入電壓WDVSS與發光電壓VD之差的值,並作為寫入電壓,由第2列之各保持電容Cs所保持。藉此,控制部50結束對第2列之各像素Px的寫入操作。 Further, during this period, the control section 50 will select the voltage VgH The scanning line Ls applied to the second column is applied to the power supply line La of the second column, and the sampling transistors Tr1 of the second column and the switching transistors Tr2 of the second column are turned on. . Further, the control unit 50 further inputs the latch pulse signal LP to the data driver 40, and causes each of the material latches 43a to hold the display data Din of the second column. The display data Din of the second column held by each of the data latches 43a is converted into an analog voltage by the display DAC 44a via the level shifter 46a, and is input to the data line Ld as the light-emission voltage VD. Then, the gate-source voltage Vgs of each of the driving transistors Tr3 in the second column is a value corresponding to the difference between the address voltage WDVSS and the light-emission voltage VD, and is used as the write voltage by the respective holding capacitors of the second column. Cs is maintained. Thereby, the control unit 50 ends the writing operation to each of the pixels Px in the second column.

以後,對像素Px之各列按照此順序進行包含 發光用之寫入操作與發光操作的發光步驟,從第1列至第n列依序以顯示用時脈週期重複這種發光步驟。藉此,控制部50以一個副圖框顯示以灰階所表現之影像。 In the future, the columns of the pixel Px are included in this order. In the light-emitting step of the writing operation and the light-emitting operation for light-emitting, the light-emitting step is repeated sequentially from the first column to the n-th column in the display clock cycle. Thereby, the control unit 50 displays the image represented by the gray scale in a sub-frame.

其次,說明EL顯示裝置之不發光期間的動作。 Next, the operation of the EL display device during the non-lighting period will be described.

如第10圖所示,在時序ta1,控制部50將起動脈衝信號SP1輸入至資料驅動器40。藉此,移位暫存器電路41將位移信號輸入至資料暫存器電路42,而資料暫存器電路42取入第1列之顯示資料Din。然後,控制部50將起動脈衝信號SP2輸入至選擇驅動器20及電源驅動器30。 As shown in FIG. 10, at timing ta1, the control unit 50 inputs the start pulse signal SP1 to the data driver 40. Thereby, the shift register circuit 41 inputs the shift signal to the data register circuit 42, and the data register circuit 42 takes in the display data Din of the first column. Then, the control unit 50 inputs the start pulse signal SP2 to the selection driver 20 and the power source driver 30.

在時序ta2,控制部50將選擇電壓VgH施加於第1列之掃描線Ls,使第1列之各取樣電晶體Tr1與第1列之各切換電晶體Tr2變成導通狀態。又,控制部50將鎖存脈衝信號LP輸入至資料驅動器40,藉此,使資料鎖存器43a保持第1列之顯示資料Din。資料鎖存器43a所保持之顯示資料Din係經由位準位移器46a,藉顯示用DAC44a變換成類比電壓後,作為不發光電壓VDN,施加於資料線Ld。 At the timing ta2, the control unit 50 applies the selection voltage VgH to the scanning line Ls of the first column, and turns the sampling transistors Tr1 of the first column and the switching transistors Tr2 of the first column into an ON state. Moreover, the control unit 50 inputs the latch pulse signal LP to the data driver 40, whereby the material latch 43a holds the display material Din of the first column. The display data Din held by the data latch 43a is converted into an analog voltage by the display DAC 44a via the level shifter 46a, and is applied to the data line Ld as the non-light-emitting voltage VDN.

在此時,控制部50對第1列之電源線La施加寫入電壓WDVSS。第1列之各驅動電晶體Tr3的閘極-源極間電壓Vgs成為因應於寫入電壓WDVSS與不發光電壓VDN之差的值,並作為寫入電壓,由保持電容Cs所保持。藉此,控制部50係對第1列之各像素Px,使保持電容Cs保持相當於前面所施加之發光電壓VD之反轉電壓的閘極-源 極間電壓Vgs,而將第1列之各驅動電晶體Tr3的每一者設為可在飽和區域驅動之狀態後,結束對第1列之各像素Px之不發光用的寫入操作。 At this time, the control unit 50 applies the write voltage WDVSS to the power line La of the first column. The gate-source voltage Vgs of each of the driving transistors Tr3 in the first column is a value corresponding to the difference between the write voltage WDVSS and the non-light-emitting voltage VDN, and is held as a write voltage by the holding capacitor Cs. Thereby, the control unit 50 holds the storage capacitor Cs for the gate-source of the inverted voltage corresponding to the previously applied light-emitting voltage VD for each pixel Px of the first column. The inter-electrode voltage Vgs is such that each of the driving transistors Tr3 of the first column is driven in a saturated region, and the writing operation for the non-light-emitting of each pixel Px in the first column is ended.

此外,在此期間,控制部50將起動脈衝信號 SP1再輸入至資料驅動器40。藉此,移位暫存器電路41將位移信號輸入至資料暫存器電路42,而在資料暫存器電路42取入第2列之顯示資料Din。 In addition, during this period, the control unit 50 will start the pulse signal. SP1 is again input to the data drive 40. Thereby, the shift register circuit 41 inputs the shift signal to the data register circuit 42, and the data register circuit 42 takes in the display data Din of the second column.

在時序ta3,控制部50將非選擇電壓VgL施加 於第1列之掃描線Ls,使第1列之各取樣電晶體Tr1與第1列之各切換電晶體Tr2變成非導通狀態。又,控制部50將寫入電壓WDVSS持續施加於第1列之電源線La。藉此,控制部50將第1列之保持電容Cs所保持的寫入電壓,即,相當於前面之發光電壓VD之反轉電壓的閘極-源極間電壓Vgs持續施加於第1列之各驅動電晶體Tr3。 At timing ta3, the control section 50 applies the non-selection voltage VgL. In the scanning line Ls of the first column, each of the sampling transistors Tr1 of the first column and the switching transistors Tr2 of the first column are brought into a non-conduction state. Moreover, the control unit 50 continuously applies the write voltage WDVSS to the power supply line La of the first column. Thereby, the control unit 50 continuously applies the write voltage held by the storage capacitor Cs of the first column, that is, the gate-source voltage Vgs corresponding to the reverse voltage of the previous light-emitting voltage VD to the first column. Each of the driving transistors Tr3.

此外,在此期間,控制部50將選擇電壓VgH 施加於第2列之掃描線Ls,而且將寫入電壓WDVSS施加於第2列之電源線La,而使第2列之各取樣電晶體Tr1與第2列之各切換電晶體Tr2變成導通狀態。又,控制部50係再將鎖存脈衝信號LP輸入至資料驅動器40,使各資料鎖存器43a保持第2列之顯示資料Din。各資料鎖存器43a所保持之第2列的顯示資料Din係經由位準位移器46a,藉顯示用DAC44a變換成類比電壓後,作為各行之不發光電壓VDN,向資料線Ld輸出。然後,控制部50將第2列之各驅動電晶體Tr3的閘極-源極間電壓Vgs設為因應於寫入電壓WDVSS與不發光電壓VDN之差的值,並作為寫入電壓 ,使第2列之各保持電容Cs保持。藉此,控制部50結束對第2列之各像素Px之不發光用的寫入操作。 Further, during this period, the control section 50 will select the voltage VgH The scanning line Ls applied to the second column is applied to the power supply line La of the second column, and the sampling transistors Tr1 of the second column and the switching transistors Tr2 of the second column are turned on. . Further, the control unit 50 further inputs the latch pulse signal LP to the data driver 40, and causes each of the material latches 43a to hold the display data Din of the second column. The display data Din of the second column held by each of the data latches 43a is converted into an analog voltage by the display DAC 44a via the level shifter 46a, and then output to the data line Ld as the non-light-emitting voltage VDN of each row. Then, the control unit 50 sets the gate-source voltage Vgs of each of the driving transistors Tr3 in the second column to a value corresponding to the difference between the write voltage WDVSS and the non-light-emitting voltage VDN, and serves as a write voltage. The holding capacitors Cs of the second column are held. Thereby, the control unit 50 ends the writing operation for the non-light-emitting of each of the pixels Px of the second column.

以後,對像素Px之各列按照此順序進行包含 不發光用之寫入操作與不發光操作的不發光步驟,從第1列至第n列依序以顯示用時脈週期重複這種不發光期間。藉此,以一個副圖框顯示以黑色所表現之影像。 In the future, the columns of the pixel Px are included in this order. In the non-light-emitting step of the non-lighting write operation and the non-light-emitting operation, the non-light-emitting period is repeated sequentially from the first column to the nth column in the display clock cycle. Thereby, the image represented by black is displayed in a sub-frame.

若依據該第1實施形態,可得到以下所列舉的優點。 According to the first embodiment, the advantages listed below can be obtained.

(1)在複數個驅動電晶體Tr3之每一者,閘極-源極間電壓Vgs係在EL元件11之發光時愈高,則在EL元件11之不發光時愈低。因此,抑制驅動電晶體Tr3之臨限值電壓的位移依各像素Px而異。 (1) In each of the plurality of driving transistors Tr3, the higher the gate-source voltage Vgs is when the EL element 11 emits light, the lower the EL element 11 does not emit light. Therefore, the displacement of the threshold voltage of the drive transistor Tr3 is suppressed to vary depending on each pixel Px.

(2)在由發光期間與不發光期間所構成之各圖框,發光電壓VD愈高,則不發光電壓VDN愈低。因此,在是顯示中重複之最短期間的各圖框抑制驅動電晶體Tr3之臨限值電壓的位移依各像素Px而異。結果,在複數個像素Px,在顯示中重複之最短期間可使驅動電晶體Tr3之臨限值電壓Vth均一化。 (2) The higher the illuminating voltage VD is, the lower the illuminating voltage VDN is in each of the frames formed by the illuminating period and the non-illuminating period. Therefore, the displacement of the threshold voltage of each of the frames suppressing the driving transistor Tr3 in the shortest period of time during display is different depending on each pixel Px. As a result, in the plurality of pixels Px, the threshold voltage Vth of the driving transistor Tr3 can be made uniform in the shortest period of repetition in display.

(3)與發光電壓VD對稱之反轉電壓被用作不發光電壓VDN。因此,被施加於驅動電晶體Tr3之閘極-源極間的電壓係經由一次之發光期間與一次之不發光期間,在複數個像素Px係均一。因此,抑制驅動電晶體Tr3之臨限值電壓的位移依各像素Px而異的效果係更提高。 (3) The inverted voltage which is symmetrical with the light-emission voltage VD is used as the non-light-emitting voltage VDN. Therefore, the voltage applied between the gate and the source of the driving transistor Tr3 is uniform in the plurality of pixels Px via the one-time light-emitting period and the one-time non-light-emitting period. Therefore, the effect of suppressing the displacement of the threshold voltage of the driving transistor Tr3 differs depending on each pixel Px.

(4)發光用之寫入電壓係藉由對驅動電晶體Tr3的源極施加經由取樣電晶體Tr1之發光電壓VD所設 定。又,不發光用之寫入電壓亦係藉由對驅動電晶體Tr3的源極施加經由取樣電晶體Tr1之不發光電壓VDN所設定。而且,藉由取樣電晶體之驅動,實現發光電壓VD之設定與不發光電壓VDN之設定。因此,可謀求發光用之寫入操作所需的構成與不發光用之寫入操作所需的構成之共同化。 (4) The write voltage for light emission is set by applying the light-emission voltage VD via the sampling transistor Tr1 to the source of the drive transistor Tr3. set. Further, the write voltage for non-light-emitting is also set by applying the non-light-emitting voltage VDN via the sampling transistor Tr1 to the source of the drive transistor Tr3. Further, the setting of the light-emission voltage VD and the setting of the non-light-emitting voltage VDN are realized by the driving of the sampling transistor. Therefore, it is possible to achieve a commonality between the configuration required for the writing operation for light emission and the configuration required for the writing operation for non-lighting.

(5)取樣電晶體Tr1之導通與切換電晶體Tr2 之導通同步,而且取樣電晶體Tr1之非導通與切換電晶體Tr2之非導通同步。因此,在各個發光用之寫入操作、發光操作、不發光用之寫入操作及不發光操作,在驅動電晶體Tr3之閘極、源極及汲極,電壓之變更係圓滑地進行。 (5) Conduction and switching transistor Tr2 of sampling transistor Tr1 The conduction is synchronized, and the non-conduction of the sampling transistor Tr1 is synchronized with the non-conduction of the switching transistor Tr2. Therefore, in the writing operation, the light-emitting operation, the writing operation for non-light-emitting, and the non-light-emitting operation for each of the light-emitting, the voltage, the source, and the drain of the driving transistor Tr3 are smoothly changed.

[第2實施形態] [Second Embodiment]

參照第11圖~第15圖,說明將在本揭示之EL顯示裝置及EL顯示裝置之驅動方法具體化的第2實施形態。此外,第2實施形態之EL顯示裝置及EL顯示裝置之驅動方法係在控制部50被賦予對應之發光電壓VD與不發光電壓VDN的關係與第1實施形態之EL顯示裝置及EL顯示裝置之驅動方法相異。因此,在以下,詳細說明發光電壓VD與不發光電壓VDN的關係,對與在第1實施形態所說明之構成相同的構成,賦予相同的符號,省略其詳細的說明。 A second embodiment in which the EL display device and the EL display device driving method of the present disclosure are embodied will be described with reference to FIGS. 11 to 15. In the EL display device and the EL display device driving method of the second embodiment, the control unit 50 is provided with the relationship between the corresponding light-emission voltage VD and the non-light-emitting voltage VDN, and the EL display device and the EL display device of the first embodiment. The driving methods are different. Therefore, the relationship between the illuminating voltage VD and the non-emission voltage VDN will be described in detail below, and the same components as those described in the first embodiment will be denoted by the same reference numerals, and detailed description thereof will be omitted.

首先,作為EL元件11所具有的特性之一,說明被施加於EL元件11之順向電壓與流至EL元件11之驅動電流的關係。此外,在第11圖。伴隨EL元件11之發光 操作所流動的電流係EL元件11之驅動電流,朝向驅動電流流至EL元件11之方向被施加於EL元件11的驅動電壓係順向電壓。 First, as one of the characteristics of the EL element 11, the relationship between the forward voltage applied to the EL element 11 and the drive current flowing to the EL element 11 will be described. Also, in Figure 11. Illumination with EL element 11 The current flowing through the operation is the driving current of the EL element 11 applied to the driving voltage of the EL element 11 in the direction in which the driving current flows to the EL element 11.

如第11圖所示,在EL元件11的驅動電壓係開 始發光電壓Vels以下時,EL元件11的驅動電流幾乎不流動。而且,即使EL元件11的驅動電流流動,該驅動電流之大小係不滿使EL元件11發光的程度。結果,在EL元件11之順向電壓係開始發光電壓Vels以下時,EL元件11係不發光。 As shown in Fig. 11, the driving voltage of the EL element 11 is turned on. When the initial light-emission voltage Vels is equal to or lower than the initial light-emission voltage Vels, the drive current of the EL element 11 hardly flows. Moreover, even if the driving current of the EL element 11 flows, the magnitude of the driving current is less than the extent to which the EL element 11 emits light. As a result, when the forward voltage of the EL element 11 starts to be lower than the emission voltage Vels, the EL element 11 does not emit light.

相對地,在EL元件11之順向電壓超過開始發 光電壓Vels時,順向電壓愈高,EL元件11之驅動電流係愈大。而且,在EL元件11之順向電壓超過開始發光電壓Vels時,EL元件11之驅動電流的大小係使EL元件11發光的程度,順向電壓愈高,EL元件11所產生之光的亮度係愈高。 In contrast, the forward voltage of the EL element 11 exceeds the start of transmission. At the time of the photovoltage Vels, the higher the forward voltage, the larger the driving current of the EL element 11. Further, when the forward voltage of the EL element 11 exceeds the initial emission voltage Vels, the magnitude of the driving current of the EL element 11 is such that the EL element 11 emits light, and the higher the forward voltage, the brightness of the light generated by the EL element 11. The higher the height.

總之,若被施加於EL元件11之電壓係逆向電 壓,EL元件11係不會發光,即使被施加於EL元件11之電壓係順向電壓,亦在開始發光電壓Vels以下的順向電壓中,EL元件11還是不發光。而且,在EL元件11之順向電壓超過開始發光電壓Vels時,EL元件11係發光。 In short, if the voltage applied to the EL element 11 is reversed When the voltage is applied, the EL element 11 does not emit light, and even if the voltage applied to the EL element 11 is forward voltage, the EL element 11 does not emit light in the forward voltage at which the emission voltage Vels is started. Further, when the forward voltage of the EL element 11 exceeds the initial emission voltage Vels, the EL element 11 emits light.

其次,以接地電壓為基準,使用該開始發光 電壓Vels,說明被施加於掃描線Ls、電源線La及資料線Ld之電壓的相關關係。此外,在第12圖,作為被施加於掃描線Ls、電源線La及資料線Ld之電壓的一例,表示基準電壓ELVSS被設定成接地電壓,而且基準電壓ELVSS 與寫入電壓WDVSS係相等之電位的構成。 Secondly, based on the ground voltage, use the start to emit light. The voltage Vels indicates the correlation between the voltages applied to the scanning line Ls, the power source line La, and the data line Ld. In addition, in the example of the voltage applied to the scanning line Ls, the power source line La, and the data line Ld, the reference voltage ELVSS is set to the ground voltage, and the reference voltage ELVSS is shown in FIG. A configuration of a potential equal to the write voltage WDVSS.

如第12圖所示,被施加於電源線La之寫入電壓WDVSS被設定成與被施加於接地電壓線Lb之基準電壓ELVSS彼此相等的電位。被施加於資料線Ld之發光電壓VD係因灰階資料所表示之各灰階而異的電壓。在發光電壓VD之範圍,作為係最接近寫入電壓WDVSS之位準的最低灰階值VDL、與係和寫入電壓WDVSS之電位差最大的位準之最高灰階值VDH之中間的值,設定中間值M。又,在發光電壓VD之範圍,作為最高灰階值VDH與中間值M之間的值,設定切換值Vp。 As shown in Fig. 12, the write voltage WDVSS applied to the power supply line La is set to a potential equal to the reference voltage ELVSS applied to the ground voltage line Lb. The illuminating voltage VD applied to the data line Ld is a voltage which varies depending on each gray scale indicated by the gray scale data. In the range of the illuminating voltage VD, the value is set as the middle of the lowest gray scale value VDL closest to the level of the write voltage WDVSS and the highest gray scale value VDH which is the level at which the potential difference between the system and the write voltage WDVSS is the largest. The intermediate value is M. Further, in the range of the light-emission voltage VD, the switching value Vp is set as a value between the highest gray-scale value VDH and the intermediate value M.

被施加於資料線Ld之不發光電壓係由第1不發光電壓VDN1及第2不發光電壓VDN2所構成。第1不發光電壓VDN1係對發光電壓VD中最低灰階值VDL與切換值Vp之間的電壓之反轉電壓。第2不發光電壓VDN2係比基準電壓ELVSS及寫入電壓WDVSS更高位準,被設定成固定的值。 The non-light-emitting voltage applied to the data line Ld is composed of the first non-light-emitting voltage VDN1 and the second non-light-emitting voltage VDN2. The first non-light-emitting voltage VDN1 is a reverse voltage of a voltage between the lowest gray-scale value VDL and the switching value Vp among the light-emitting voltages VD. The second non-light-emitting voltage VDN2 is set to a higher value than the reference voltage ELVSS and the write voltage WDVSS.

以寫入電壓WDVSS為基準之第1不發光電壓VDN1的極性係與以寫入電壓WDVSS為基準之發光電壓VD的極性相同。以寫入電壓WDVSS為基準之第2不發光電壓VDN2的極性係與以寫入電壓WDVSS為基準之發光電壓VD的極性相異,這些彼此具有反極性。以寫入電壓WDVSS為基準之發光電壓VD的極性係負,以寫入電壓WDVSS為基準之第1不發光電壓VDN1的極性亦係負。另一方面,以寫入電壓WDVSS為基準之第2不發光電壓VDN2的極性係正。 The polarity of the first non-light-emitting voltage VDN1 based on the write voltage WDVSS is the same as the polarity of the light-emitting voltage VD based on the write voltage WDVSS. The polarity of the second non-light-emitting voltage VDN2 based on the write voltage WDVSS is different from the polarity of the light-emitting voltage VD based on the write voltage WDVSS, and these have opposite polarities. The polarity of the light-emission voltage VD based on the write voltage WDVSS is negative, and the polarity of the first non-light-emitting voltage VDN1 based on the write voltage WDVSS is also negative. On the other hand, the polarity of the second non-light-emitting voltage VDN2 based on the write voltage WDVSS is positive.

此外,以寫入電壓WDVSS為基準之第1不發 光電壓VDN1的極性係與以寫入電壓WDVSS為基準之非選擇電壓VgL的極性一樣是負。以寫入電壓WDVSS為基準之第2不發光電壓VDN2的極性係與以寫入電壓WDVSS為基準之選擇電壓VgH的極性一樣是正。又,第2不發光電壓VDN2係比驅動電壓ELVDD之位準及選擇電壓VgH之位準更低,以第2不發光電壓VDN2為基準之驅動電壓ELVDD的極性係與以第2不發光電壓VDN2為基準之寫入電壓WDVSS的極性相異。 In addition, the first one is based on the write voltage WDVSS. The polarity of the photovoltage VDN1 is negative as the polarity of the non-selection voltage VgL based on the write voltage WDVSS. The polarity of the second non-light-emitting voltage VDN2 based on the write voltage WDVSS is positive as the polarity of the selection voltage VgH based on the write voltage WDVSS. Further, the second non-light-emitting voltage VDN2 is lower than the level of the driving voltage ELVDD and the level of the selection voltage VgH, and the polarity of the driving voltage ELVDD based on the second non-light-emitting voltage VDN2 is the second non-light-emitting voltage VDN2. The polarity of the write voltage WDVSS for the reference is different.

又,以寫入電壓WDVSS為基準之發光電壓VD 的極性係與以寫入電壓WDVSS為基準之非選擇電壓VgL的極性一樣是負。發光電壓VD之位準被設定於非選擇電壓VgL與寫入電壓WDVSS之間。 Further, the light-emitting voltage VD based on the write voltage WDVSS The polarity is negative as the polarity of the non-selection voltage VgL based on the write voltage WDVSS. The level of the light-emission voltage VD is set between the non-selection voltage VgL and the write voltage WDVSS.

順帶一提,基準電壓ELVSS亦可比接地電壓 更高位準,亦可係比接地電壓更低位準。又,寫入電壓WDVSS亦可係比基準電壓ELVSS更低位準。 Incidentally, the reference voltage ELVSS can also be compared to the ground voltage. Higher levels can also be lower than the ground voltage. Further, the write voltage WDVSS may be lower than the reference voltage ELVSS.

參照第13圖,說明發光電壓VD與第1不發光 電壓VDN1之關係,及發光電壓VD與第2不發光電壓VDN2之關係。第13圖係表示影像信號處理部54所賦予對應之發光電壓VD與第1不發光電壓VDN1的關係,及影像信號處理部54所賦予對應之發光電壓VD與第2不發光電壓VDN2之關係的曲線圖。 Referring to Fig. 13, the illuminating voltage VD and the first non-lighting are explained. The relationship between the voltage VDN1 and the relationship between the illuminating voltage VD and the second non-emissive voltage VDN2. Fig. 13 is a view showing the relationship between the corresponding light-emission voltage VD and the first non-light-emitting voltage VDN1 given by the video signal processing unit 54, and the relationship between the corresponding light-emitting voltage VD and the second non-light-emitting voltage VDN2 given by the video signal processing unit 54. Graph.

如第13圖所示,第1不發光電壓VDN1相當於 在發光電壓VD與切換值Vp相同或比其更低時的不發光電壓。即,第1不發光電壓VDN1係對切換值Vp以上且最 低灰階值VDL以下之發光電壓VD的值被賦予對應。例如,在發光電壓VD係最低灰階值VDL之0V時,作為第1不發光電壓VDN1,-9.2V被賦予對應,在發光電壓VD係中間值M之-5V時,作為第1不發光電壓VDN1,-4.2V被賦予對應。而且,在發光電壓VD係切換值Vp之-9.2V時,作為第1不發光電壓VDN1,0V被賦予對應。此外,發光電壓VD之設定的範圍係配合基準電壓、寫入電壓WDVSS、驅動電壓ELVDD及EL元件11之驅動適當地設定,亦可是從0V至-10V以外。 As shown in Fig. 13, the first non-light-emitting voltage VDN1 is equivalent to A non-emissive voltage when the illuminating voltage VD is the same as or lower than the switching value Vp. That is, the first non-light-emitting voltage VDN1 is equal to or greater than the switching value Vp. The value of the light-emission voltage VD below the low gray-scale value VDL is given a correspondence. For example, when the illuminating voltage VD is 0 V of the lowest gray scale value VDL, -9.2 V is given as the first non-light-emitting voltage VDN1, and the first non-light-emitting voltage is used when the illuminating voltage VD is -5 V of the intermediate value M. VDN1, -4.2V are assigned corresponding. When the illuminating voltage VD is -9.2 V of the switching value Vp, 0 V is given as the first non-light-emitting voltage VDN1. Further, the range in which the light-emission voltage VD is set is appropriately set in accordance with the reference voltage, the write voltage WDVSS, the drive voltage ELVDD, and the driving of the EL element 11, and may be other than 0V to -10V.

而且,控制部50係以對在一個圖框之各像素 Px,需要切換值Vp以上且最低灰階值VDL以下之發光電壓VD時,產生用以產生該發光電壓VD之顯示資料Din的方式所構成。又,控制部50係以對在一個圖框之各像素Px,需要切換值Vp以上且最低灰階值VDL以下之發光電壓VD時,產生用以產生成為該發光電壓VD之反轉電壓的第1不發光電壓VDN1之顯示資料Din的方式所構成。 Moreover, the control unit 50 is configured to face each pixel in one frame. Px is configured to generate a display data Din for generating the light-emission voltage VD when the light-emitting voltage VD of the value Vp or more and the lowest gray-scale value VDL or less is required to be switched. In addition, when the control unit 50 needs to switch the light-emitting voltage VD equal to or higher than the minimum value of the gray level VDL to the pixel Px of one frame, the control unit 50 generates the inverted voltage for generating the light-emitting voltage VD. 1 is formed by the method of displaying the data Din without the light-emitting voltage VDN1.

第2不發光電壓VDN2相當於在發光電壓VD 比切換值Vp更高時的不發光電壓。即,第2不發光電壓VDN2係對最高灰階值VDH以上且未滿切換值Vp之發光電壓VD的值被賦予對應。例如,在發光電壓VD係最高灰階值VDH之-10V時,作為第2不發光電壓VDN2,3V被賦予對應,在發光電壓VD係最接近切換值Vp之值時,這亦作為第2不發光電壓VDN2,3V被賦予對應。 The second non-emissive voltage VDN2 is equivalent to the illuminating voltage VD A non-light-emitting voltage when the switching value Vp is higher. In other words, the second non-light-emitting voltage VDN2 is assigned to the value of the light-emission voltage VD that is equal to or higher than the highest gray-scale value VDH and less than the switching value Vp. For example, when the light-emitting voltage VD is -10 V of the highest gray-scale value VDH, 3V is given as the second non-light-emitting voltage VDN2, and when the light-emitting voltage VD is closest to the value of the switching value Vp, this is also the second The illuminating voltages VDN2, 3V are given a correspondence.

而且,控制部50係以對在一個圖框之各像素Px,需要最高灰階值VDH以上且未滿切換值Vp之發光電 壓VD時,產生用以產生該發光電壓VD之顯示資料Din的方式所構成。又,控制部50係以對在一個圖框之各像素Px,需要最高灰階值VDH以上且未滿切換值Vp之發光電壓VD時,產生用以產生是固定值之3V的第2不發光電壓VDN2之顯示資料Din的方式所構成。 Further, the control unit 50 is configured to emit light of the highest grayscale value VDH or more and less than the switching value Vp for each pixel Px in one frame. When VD is pressed, a display data Din for generating the light-emission voltage VD is generated. Further, the control unit 50 generates a second non-lighting for generating a fixed value of 3 V when the illuminating voltage VD of the highest grayscale value VDH or more and less than the switching value Vp is required for each pixel Px in one frame. The voltage VDN2 is formed by the method of displaying the data Din.

例如,控制部50之影像信號處理部54具備用 以產生發光電壓VD之顯示資料Din(發光用灰階資料)與顯示資料Din的最高階臨限值之差分值的差分電路。又,控制部50之影像信號處理部54具備比較電路,該比較電路係比較用以產生發光電壓VD之顯示資料Din與係相當於切換值Vp之灰階值的切換灰階值。而且,控制部50之影像信號處理部54係每當產生用以產生發光電壓VD之顯示資料Din,比較該顯示資料Din與切換灰階值。在顯示資料Din與切換灰階值相同或比其更低時,控制部50之影像信號處理部54係將該顯示資料Din應用於差分電路,與第1實施例一樣地產生用以產生第1不發光電壓VDN1之顯示資料Din(不發光用灰階資料)。相對地,在顯示資料Din比切換灰階值更高時,控制部50之影像信號處理部54產生用以產生第2不發光電壓VDN2之顯示資料Din(不發光用灰階資料)。 For example, the video signal processing unit 54 of the control unit 50 is provided with A difference circuit for generating a difference value between the display data Din (light-emitting gradation data) of the illuminating voltage VD and the highest-order threshold value of the display data Din. Further, the video signal processing unit 54 of the control unit 50 includes a comparison circuit that compares the display data Din for generating the illuminating voltage VD with the switching gradation value corresponding to the grayscale value of the switching value Vp. Further, the video signal processing unit 54 of the control unit 50 compares the display data Din with the switching grayscale value every time the display data Din for generating the light-emission voltage VD is generated. When the display data Din is equal to or lower than the switching grayscale value, the video signal processing unit 54 of the control unit 50 applies the display data Din to the differential circuit, and generates the first one as in the first embodiment. The display data Din of the non-light-emitting voltage VDN1 (gray-level data for non-lighting). On the other hand, when the display data Din is higher than the switching grayscale value, the video signal processing unit 54 of the control unit 50 generates the display data Din (the grayscale data for no light emission) for generating the second non-light-emitting voltage VDN2.

這種第2不發光電壓VDN2係開始發光電壓 Vels以下的位準,並根據在不發光期間之藉驅動電路PCC驅動EL元件11的形態與上述之開始發光電壓Vels,如以下所示設定。 This second non-emissive voltage VDN2 is the starting illuminating voltage The level below the Vels is set as shown below in accordance with the form in which the EL element 11 is driven by the drive circuit PCC during the non-lighting period and the above-described starting light emission voltage Vels.

如第14圖所示,在電源線La被施加寫入電壓 WDVSS、掃描線Ls被施加選擇電壓VgH時,取樣電晶體Tr1及切換電晶體Tr2係導通狀態。在取樣電晶體Tr1及切換電晶體Tr2係導通狀態時,驅動電晶體Tr3係在飽和區域驅動。在此狀態,資料線Ld被施加第2不發光電壓VDN2時,因應於電源線La之電壓與資料線Ld之電壓之電位差的寫入電壓作為驅動電晶體Tr3之閘極-源極間電壓Vgs,被保持電容Cs所保持。 As shown in Figure 14, a write voltage is applied to the power line La. When the selection voltage VgH is applied to the WDVSS and the scanning line Ls, the sampling transistor Tr1 and the switching transistor Tr2 are turned on. When the sampling transistor Tr1 and the switching transistor Tr2 are in an on state, the driving transistor Tr3 is driven in the saturation region. In this state, when the second non-light-emitting voltage VDN2 is applied to the data line Ld, the write voltage corresponding to the potential difference between the voltage of the power supply line La and the voltage of the data line Ld is used as the gate-source voltage Vgs of the driving transistor Tr3. It is held by the holding capacitor Cs.

在此時,因為第2不發光電壓VDN2係比寫入 電壓WDVSS更高位準,所以電流不流至驅動電晶體Tr3。另一方面,因為第2不發光電壓VDN2係比基準電壓ELVSS更高位準,EL元件11之順向電壓被施加於EL元件11。 At this time, because the second non-lighting voltage VDN2 is better than writing The voltage WDVSS is higher, so current does not flow to the driving transistor Tr3. On the other hand, since the second non-light-emitting voltage VDN2 is higher than the reference voltage ELVSS, the forward voltage of the EL element 11 is applied to the EL element 11.

在此,第2不發光電壓VDN2係在不發光用之 寫入操作時,將開始發光電壓Vels以下之電位差設定於在寫入操作時之驅動電晶體Tr3的源極與基準電壓ELVSS之間。而且,若在寫入操作時之驅動電晶體Tr3的源極與基準電壓ELVSS之間的電位差係開始發光電壓Vels以下,則即使被施加於EL元件11之電壓係順向電壓,EL元件11亦不發光。 Here, the second non-light-emitting voltage VDN2 is used for non-lighting. At the time of the write operation, the potential difference equal to or lower than the start of the light-emission voltage Vels is set between the source of the drive transistor Tr3 and the reference voltage ELVSS at the time of the write operation. When the potential difference between the source of the drive transistor Tr3 and the reference voltage ELVSS at the time of the write operation is equal to or lower than the start of the light-emission voltage Vels, the EL element 11 is applied even if the voltage applied to the EL element 11 is the forward voltage. Does not shine.

如第15圖所示,在不發光用之寫入電壓被保持電容Cs保持的狀態,非選擇電壓VgL被施加於掃描線Ls時,取樣電晶體Tr1及切換電晶體Tr2係非導通狀態。在此狀態,寫入電壓WDVSS被持續施加於電源線La時,與上述之寫入操作一樣,電流不流至驅動電晶體Tr3。另一方面,因為在寫入操作後之驅動電晶體Tr3的源極係遠 大於基準電壓ELVSS之更高位準,所以順向電壓持續被施加於EL元件11。而且,藉由EL元件11不發光之程度的電流在EL元件11流動,而將保持電容Cs放電。 As shown in Fig. 15, when the write voltage for non-light-emitting is held by the holding capacitor Cs, when the non-selection voltage VgL is applied to the scanning line Ls, the sampling transistor Tr1 and the switching transistor Tr2 are in a non-conduction state. In this state, when the write voltage WDVSS is continuously applied to the power supply line La, the current does not flow to the drive transistor Tr3 as in the above-described write operation. On the other hand, since the source of the driving transistor Tr3 after the writing operation is far away It is higher than the higher level of the reference voltage ELVSS, so the forward voltage is continuously applied to the EL element 11. Further, a current of a degree that the EL element 11 does not emit light flows in the EL element 11, and the holding capacitor Cs is discharged.

[EL顯示裝置之作用] [The role of EL display device]

其次,說明EL顯示裝置之不發光期間的動作。 Next, the operation of the EL display device during the non-lighting period will be described.

控制部50係首先,將選擇電壓VgH施加於第1列之掃描線Ls,使第1列之各取樣電晶體Tr1與第1列之各切換電晶體Tr2變成導通狀態,並將不發光電壓施加於資料線Ld。在此時,控制部50對第1列之電源線La施加寫入電壓WDVSS。然後,第1列之各驅動電晶體Tr3的閘極-源極間電壓Vgs成為因應於寫入電壓WDVSS與不發光電壓VDN之差的值,並作為寫入電壓,由保持電容Cs所保持。 The control unit 50 first applies the selection voltage VgH to the scanning line Ls of the first column, and turns the sampling transistors Tr1 of the first column and the switching transistors Tr2 of the first column into an on state, and applies a non-light-emitting voltage. On the data line Ld. At this time, the control unit 50 applies the write voltage WDVSS to the power line La of the first column. Then, the gate-source voltage Vgs of each of the driving transistors Tr3 in the first column is a value corresponding to the difference between the write voltage WDVSS and the non-light-emitting voltage VDN, and is held as a write voltage by the holding capacitor Cs.

此時,在一個像素Px之在發光期間的發光電壓VD係切換值Vp以上且最低灰階值VDL以下時,控制部50係在接著該發光期間的不發光期間,使資料驅動器40產生係發光電壓VD之反轉電壓的第1不發光電壓VDN1。相對此,一個像素Px之在發光期間的發光電壓VD係最高灰階值VDH以上且未滿切換值Vp時,控制部50係在接著該發光期間的不發光期間,使資料驅動器40產生係固定值之第2不發光電壓VDN2。 At this time, when the light-emitting voltage VD of the one-pixel Px is equal to or higher than the switching value Vp and the lowest gray-scale value VDL, the control unit 50 causes the data driver 40 to emit light during the non-light-emitting period following the light-emitting period. The first non-emissive voltage VDN1 of the inversion voltage of the voltage VD. On the other hand, when the light-emitting voltage VD of the light-emitting period of one pixel Px is equal to or higher than the highest gray-scale value VDH and less than the switching value Vp, the control unit 50 causes the data driver 40 to be fixed during the non-light-emitting period following the light-emitting period. The second non-emissive voltage VDN2 of the value.

藉此,控制部50係對第1列之各像素Px,在發光電壓VD係切換值Vp以上且最低灰階值VDL以下時,使保持電容Cs保持相當於前面之發光電壓VD的反轉電壓之閘極-源極間電壓Vgs,並結束對第1列之各像素Px之不發光用的寫入操作。又,對第1列之各像素Px,在發光電 壓VD係最高灰階值VDH以上且未滿切換值Vp時,控制部50係不論前面之發光電壓VD的值,都使保持電容Cs保持相當於第2不發光電壓VDN2之閘極-源極間電壓Vgs,並結束對第1列之各像素Px之不發光用的寫入操作。 In this case, the control unit 50 maintains the storage capacitor Cs at a reverse voltage corresponding to the preceding light-emitting voltage VD when the light-emitting voltage VD is equal to or higher than the switching value Vp and the lowest grayscale value VDL. The gate-source voltage Vgs ends the writing operation for the non-light-emitting of each pixel Px of the first column. Moreover, for each pixel Px of the first column, in the light-emitting When the voltage VD is higher than the gray level value VDH and less than the switching value Vp, the control unit 50 maintains the gate capacitance of the second non-light-emitting voltage VDN2 regardless of the value of the previous light-emitting voltage VD. The voltage Vgs is interrupted, and the writing operation for the non-light-emitting of each pixel Px of the first column is ended.

以後,按像素Px之各列以此順序進行包含不 發光用之寫入操作與不發光操作的不發光步驟,從第1列至第n列依序以顯示用時脈週期重複這種不發光步驟。藉此,以一個副圖框顯示以黑色所表現之影像。 In the future, the columns of pixels Px are included in this order. In the non-light-emitting step of the writing operation for the light emission and the non-light-emitting operation, the non-light-emitting step is repeated sequentially from the first column to the nth column in the display clock cycle. Thereby, the image represented by black is displayed in a sub-frame.

若依據該第2實施形態,可得到以下所列舉的優點。 According to the second embodiment, the advantages listed below can be obtained.

(1)在發光電壓VD比切換值Vp更高時,保持電容Cs保持極性與發光電壓VD相異之第2不發光電壓VDN2。因此,在驅動電晶體Tr3之臨限值電壓Vth的位移在特定像素Px過度地進行的情況,對該特定像素Px,抑制臨限值電壓Vth的位移。結果,抑制驅動電晶體Tr3之臨限值電壓Vth的位移依各像素Px而異之效果的所及範圍係對臨限值電壓Vth之位移的程度而被擴大。 (1) When the light-emission voltage VD is higher than the switching value Vp, the holding capacitor Cs holds the second non-light-emitting voltage VDN2 whose polarity is different from the light-emission voltage VD. Therefore, when the displacement of the threshold voltage Vth of the driving transistor Tr3 is excessively performed in the specific pixel Px, the displacement of the threshold voltage Vth is suppressed for the specific pixel Px. As a result, the range in which the effect of suppressing the displacement of the threshold voltage Vth of the drive transistor Tr3 differs depending on the pixel Px is expanded to the extent of the displacement of the threshold voltage Vth.

(2)在被施加第2不發光電壓VDN2之驅動電路PCC,經由EL元件11,將保持電容Cs放電。因此,EL顯示裝置的動作係在從不發光期間切換為發光期間時,抑制保持電容Cs所保持之電位差急速地變化。 (2) The drive circuit PCC to which the second non-light-emitting voltage VDN2 is applied discharges the storage capacitor Cs via the EL element 11. Therefore, when the operation of the EL display device is switched to the light-emitting period from the non-light-emitting period, the potential difference held by the holding capacitor Cs is suppressed from rapidly changing.

[第3實施形態] [Third embodiment]

參照第16圖~第26圖,說明將在本揭示之EL顯示裝置及EL顯示裝置之驅動方法具體化的第3實施形態。此外,第3實施形態之EL顯示裝置及EL顯示裝置之驅動方法 係對第1實施形態之EL顯示裝置及EL顯示裝置之驅動方法、第2實施形態之EL顯示裝置及EL顯示裝置之驅動,進而,加上檢測出驅動電晶體Tr3之臨限值電壓Vth的檢測動作及檢測步驟。因此,在以下,詳細說明檢測動作及檢測步驟,對與在第1實施形態所說明之構成相同的構成,又,與在第2實施形態所說明之構成相同的構成,賦予相同的符號,省略其詳細的說明。 A third embodiment in which the EL display device and the EL display device driving method of the present disclosure are embodied will be described with reference to FIGS. 16 to 26. Further, an EL display device and a driving method of the EL display device according to the third embodiment The EL display device and the EL display device driving method according to the first embodiment, the EL display device and the EL display device of the second embodiment are driven, and further, the threshold voltage Vth of the driving transistor Tr3 is detected. Detection actions and detection steps. Therefore, the detection operation and the detection procedure will be described in detail below, and the same configurations as those described in the first embodiment are given, and the same configurations as those described in the second embodiment are denoted by the same reference numerals, and the description is omitted. Its detailed description.

[控制部50的構成] [Configuration of Control Unit 50]

如第16圖所示,時序控制器52產生資料位移時脈信號Clkd、顯示用位移時脈信號Clks及檢測用位移時脈信號Clkr。時序控制器52向資料驅動器40輸出資料位移時脈信號Clkd,向選擇驅動器20及電源驅動器30輸出顯示用位移時脈信號Clks,並向選擇驅動器20及電源驅動器30輸出檢測用位移時脈信號Clkr。 As shown in Fig. 16, the timing controller 52 generates a data displacement clock signal Clkd, a display displacement clock signal Clks, and a detection displacement clock signal Clkr. The timing controller 52 outputs the data displacement clock signal Clkd to the data driver 40, outputs the display displacement clock signal Clks to the selection driver 20 and the power source driver 30, and outputs the detection displacement clock signal Clkr to the selection driver 20 and the power source driver 30. .

檢測用位移時脈信號Clkr係在檢測動作,決定選擇對象之候補的切換週期。選擇驅動器20係每當檢測用位移時脈信號Clkr上升,就按照第1列之掃描線Ls、第2列之掃描線Ls、…、第m列之掃描線Ls的順序,逐條選擇被施加選擇電壓VgH之候補。電源驅動器30係每當檢測用位移時脈信號Clkr上升,就按照第1列之電源線La、第2列之電源線La、…、第m列之電源線La的順序,逐條選擇電源線La。係檢測用位移時脈信號Clkr之時脈週期的檢測用時脈週期係遠比顯示用週期短較佳。例如,檢測用時脈週期係與資料位移時脈信號Clkd之時脈週期相同較佳。 The detection displacement clock signal Clkr is used for the detection operation, and determines the switching period of the candidate to be selected. The selection driver 20 selects one by one in accordance with the order of the scanning line Ls of the first column, the scanning line Ls of the second column, the scanning line Ls of the second column, and the scanning line Ls of the m-th column, in the order of the detection of the displacement pulse signal Clkr. The candidate for the voltage VgH is selected. The power driver 30 selects the power line one by one in the order of the power line La of the first column, the power line La of the second column, the power line La of the second column, and the power line La of the mth column, each time the power pulse line Clkr of the detection is increased. La. The clock cycle for detecting the clock period of the displacement clock signal Clkr for detection is much shorter than the display period. For example, the clock period for detection is preferably the same as the clock period of the data shift clock signal Clkd.

而且,在發光期間,選擇驅動器20以顯示用 時脈週期掃描選擇對象之候補,在不發光期間,選擇驅動器20亦以顯示用時脈週期掃描選擇對象之候補。另一方面,在檢測動作,選擇驅動器20以檢測用時脈週期掃描選擇對象之候補。又,在發光期間,電源驅動器30以顯示用時脈週期掃描供給對象之候補,在不發光期間,亦以顯示用時脈週期掃描供給對象之候補。另一方面,在檢測動作,電源驅動器30以檢測用時脈週期掃描供給對象之候補。 Moreover, during illumination, the driver 20 is selected for display. The candidate for the clock cycle scan selection target, during the non-lighting period, the selection driver 20 also scans the candidates for the selection target in the display clock cycle. On the other hand, in the detection operation, the selection driver 20 scans the candidate for the selection target by the clock cycle. Further, during the light-emitting period, the power source driver 30 scans the candidate for the supply target in the display clock cycle, and scans the candidate for the supply target in the display clock cycle during the non-light-emitting period. On the other hand, in the detection operation, the power source driver 30 scans the candidates of the supply target in the detection clock cycle.

檢測用位移時脈信號Clkr係在按照檢測用時 脈週期重複高位準與低位準中,包含僅在檢測期間維持低位準的位移等待部分。位移等待部分之被輸出的時序係每當檢測用位移時脈信號Clkr之被輸出的機會,即每當進行檢測動作時位移。 The detection of the displacement clock signal Clkr is used according to the detection time. The pulse period repeats the high level and low level, including the displacement waiting portion that maintains the low level only during the detection period. The timing sequence at which the displacement waiting portion is output is the opportunity to output the displacement pulse signal Clkr whenever the detection is performed, that is, every time the detection operation is performed.

例如,在這次之檢測動作,檢測用位移時脈 信號Clkr係按照時脈週期重複高位準與低位準q次(1≦q≦m),然後,繼續位移等待部分。另一方面,在下次之檢測動作,檢測用位移時脈信號Clkr係重複高位準與低位準q+1次(1≦q≦m),然後,繼續位移等待部分。 藉此,在這次之檢測動作,從第1條掃描線Ls至第q條掃描線Ls,作為選擇對象之候補,按照檢測用時脈週期依序切換。而且,在已經過檢測期間後,從第q+1條掃描線Ls至第m條掃描線Ls,作為選擇對象之候補,以檢測用時脈週期依序再切換。又,在下次之檢測動作,從第1條掃描線Ls至第q+1條掃描線Ls,作為選擇對象之候補, 以檢測用時脈週期依序切換。而且,在已經過檢測期間後,從第q+2條掃描線Ls至第m條掃描線Ls,作為選擇對象之候補,以檢測用時脈週期依序切換。 For example, in this detection action, the displacement time is detected. The signal Clkr repeats the high level and the low level q times (1≦q≦m) according to the clock cycle, and then continues the displacement waiting portion. On the other hand, in the next detection operation, the detection displacement clock signal Clkr repeats the high level and the low level q+1 times (1≦q≦m), and then continues the displacement waiting portion. As a result, in this detection operation, the first scanning line Ls to the qth scanning line Ls are sequentially selected as candidates for selection, and are sequentially switched in accordance with the detection clock cycle. Then, after the detection period has elapsed, the q+1th scanning line Ls to the mth scanning line Ls are candidates for selection, and the detection clock cycle is sequentially switched. Further, in the next detection operation, the first scanning line Ls to the q+1th scanning line Ls are candidates for selection. The detection clock cycle is sequentially switched. Then, after the detection period has elapsed, the q+2th scanning line Ls to the mth scanning line Ls are candidates for selection, and the detection clock cycles are sequentially switched.

時序控制器52產生起動脈衝信號SP1、起動脈 衝信號SP2、鎖存脈衝信號LP及掩蔽脈衝信號MP。時序控制器52將起動脈衝信號SP1及鎖存脈衝信號LP輸入至資料驅動器40。時序控制器52將起動脈衝信號SP2及掩蔽脈衝信號MP輸入至選擇驅動器20、電源驅動器30及影像信號處理部54。 The timing controller 52 generates a start pulse signal SP1 and an artery The punch signal SP2, the latch pulse signal LP, and the mask pulse signal MP. The timing controller 52 inputs the start pulse signal SP1 and the latch pulse signal LP to the data driver 40. The timing controller 52 inputs the start pulse signal SP2 and the mask pulse signal MP to the selection driver 20, the power source driver 30, and the video signal processing unit 54.

起動脈衝信號SP2係控制選擇驅動器20之處 理時序的控制信號,將選擇對象之候補的切換所使用之位移時脈信號切換成顯示用時脈週期與檢測用時脈週期。起動脈衝信號SP2係控制電源驅動器30之處理時序的控制信號,將供給對象之候補的切換所使用之位移時脈信號切換成顯示用時脈週期與檢測用時脈週期。時序控制器52係每當輸入起動脈衝信號SP2僅設定次數,就將選擇對象之候補的切換所使用之位移時脈信號從顯示用時脈週期切換成檢測用時脈週期。時序控制器52係每當輸入起動脈衝信號SP2僅設定次數,就將供給對象之候補的切換所使用之位移時脈信號從顯示用時脈週期切換成檢測用時脈週期。 The start pulse signal SP2 controls where the drive 20 is selected The timing control signal is used to switch the displacement clock signal used for switching the candidate of the selection target to the display clock period and the detection clock period. The start pulse signal SP2 is a control signal for controlling the processing timing of the power source driver 30, and switches the displacement clock signal used for switching the candidate to be supplied to the display clock cycle and the detection clock cycle. The timing controller 52 switches the displacement clock signal used for the switching of the candidate to be selected from the display clock cycle to the detection clock cycle every time the input start pulse signal SP2 is set only for the number of times. The timing controller 52 switches the displacement clock signal used for the switching of the candidate to be supplied from the display clock cycle to the detection clock cycle every time the input start pulse signal SP2 is set only for the number of times.

此外,在第3實施形態,設定次數被設定成3 次,時序控制器52係每當輸入起動脈衝信號SP2 3次,就將位移時脈信號從顯示用時脈週期變更成檢測用時脈週期。而且,例如,根據第3n次之起動脈衝信號SP2的輸入 ,m條掃描線Ls作為選擇對象之候補,以顯示用時脈週期依序切換後,進行發光用之寫入操作與發光操作。接著,根據第3n+1次之起動脈衝信號SP2的輸入,m條掃描線Ls作為選擇對象之候補,以顯示用時脈週期依序切換後,進行不發光用之寫入操作與不發光操作。然後,根據第3n+2次之起動脈衝信號SP2的輸入,m條掃描線Ls作為選擇對象之候補,以檢測用時脈週期依序切換後,進行檢測動作。 Further, in the third embodiment, the number of settings is set to 3 The timing controller 52 changes the displacement clock signal from the display clock period to the detection clock period every time the start pulse signal SP2 is input three times. Moreover, for example, according to the input of the 3nth start pulse signal SP2 The m scanning lines Ls are candidates for selection, and the display operation and the light-emitting operation for light-emitting are performed after the display clock cycles are sequentially switched. Then, based on the input of the 3n+1th start pulse signal SP2, the m scanning lines Ls are candidates for selection, and after the display clock cycles are sequentially switched, the writing operation and the non-lighting operation for non-lighting are performed. . Then, based on the input of the 3n+2th start pulse signal SP2, the m scanning lines Ls are candidates for selection, and the detection operation is performed after the detection clock cycles are sequentially switched.

掩蔽脈衝信號MP係控制選擇驅動器20之處 理時序的控制信號,控制在選擇驅動器20所產生之位移信號的輸出。在掩蔽脈衝信號MP係高位準時,在選擇驅動器20,根據在選擇驅動器20所產生之位移信號,選擇電壓VgH被施加於掃描線Ls之任一條。另一方面,在掩蔽脈衝信號MP係低位準時,在選擇驅動器20,不論在選擇驅動器20所產生之位移信號,非選擇電壓VgL被施加於全部之掃描線Ls。 The masking pulse signal MP is used to control the selection of the driver 20 The timing control signal controls the output of the displacement signal generated by the selection driver 20. When the mask pulse signal MP is at the high level, the driver 20 is selected, and the selection voltage VgH is applied to any one of the scanning lines Ls based on the displacement signal generated by the selection driver 20. On the other hand, when the mask pulse signal MP is at the low level, the driver 20 is selected, and the non-selection voltage VgL is applied to all of the scanning lines Ls regardless of the displacement signal generated by the selection driver 20.

掩蔽脈衝信號MP係平常被設定成高位準,每 當輸出起動脈衝信號SP2僅設定次數,就從高位準切換成低位準,而且包含僅在檢測期間維持高位準之掩蔽解除部分。掩蔽解除部分之被輸出的時序係與該位移等待部分之輸出同步,每當進行檢測動作就位移。 The masking pulse signal MP is usually set to a high level, each When the output start pulse signal SP2 is set only for a number of times, it is switched from a high level to a low level, and includes a mask release portion that maintains a high level only during detection. The output timing of the mask release portion is synchronized with the output of the displacement waiting portion, and is displaced every time the detection operation is performed.

例如,在這次之檢測動作中,在檢測用位移 時脈信號Clkr,重複高位準與低位準q次(1≦q≦m),然後,輸出掩蔽解除部分。另一方面,在下次之檢測動作,在檢測用位移時脈信號Clkr,重複高位準與低位準q+1 次(1≦q≦m),然後,輸出掩蔽解除部分。藉此,在這次之檢測動作中,首先,從第1條掃描線Ls至第q條掃描線Ls,作為選擇對象之候補,以檢測用時脈週期依序切換。而且,在此期間,禁止對掃描線Ls施加選擇電壓VgH。接著,在選擇對象之候補的切換停止的檢測期間,對係那時為候補之第q列的掃描線Ls,施加選擇電壓VgH。 另一方面,在下次之檢測動作,首先,從第1條掃描線Ls至第q+1條掃描線Ls,作為選擇對象之候補,以檢測用時脈週期依序切換。而且,在此期間,禁止對掃描線Ls施加選擇電壓VgH。接著,在選擇對象之候補的切換停止的檢測期間,對係那時之候補之第q+1列的掃描線Ls,施加選擇電壓VgH。 For example, in this detection action, the displacement is detected. The clock signal Clkr repeats the high level and the low level q times (1≦q≦m), and then outputs the mask release portion. On the other hand, in the next detection action, the displacement clock signal Clkr is detected, and the high level and the low level q+1 are repeated. Times (1≦q≦m), then, the mask release section is output. In this detection operation, first, the first scanning line Ls to the qth scanning line Ls are selected as candidates for selection, and the detection clock cycles are sequentially switched. Moreover, during this period, the selection voltage VgH is prohibited from being applied to the scanning line Ls. Next, during the detection period of the switching stop of the selection target candidate, the selection voltage VgH is applied to the scanning line Ls of the qth column which is the candidate at that time. On the other hand, in the next detection operation, first, from the first scanning line Ls to the q+1th scanning line Ls, as candidates for selection, the detection clock cycles are sequentially switched. Moreover, during this period, the selection voltage VgH is prohibited from being applied to the scanning line Ls. Next, during the detection period of the switching stop of the selection target candidate, the selection voltage VgH is applied to the scanning line Ls of the q+1th column which is the candidate at that time.

記憶部53具備對複數個像素Px之每一者被賦 予對應之m列×n行的記憶區域。記憶部53係從資料驅動器40取入檢測資料Dout。檢測資料Dout係關於各像素Px之臨限值電壓Vth的資料,例如是8位元的資料。記憶部53將各像素Px之檢測資料Dout記憶於對該像素Px被賦予對應的記憶區域。記憶部53係將當時之資料記憶於對像素Px被賦予對應的記憶區域,而更新檢測資料Dout。 The memory unit 53 is provided with each of a plurality of pixels Px The memory area corresponding to m columns x n rows. The memory unit 53 takes in the detection data Dout from the data driver 40. The detection data Dout is information on the threshold voltage Vth of each pixel Px, and is, for example, 8-bit data. The memory unit 53 stores the detection data Dout of each pixel Px in a memory area to which the corresponding pixel Px is assigned. The memory unit 53 stores the current data in a memory area to which the pixel Px is assigned, and updates the detection data Dout.

影像信號處理部54讀入記憶部53所記憶之各像素Px的檢測資料Dout。影像信號處理部54係對各像素Px之發光用灰階資料,實施根據各像素Px之檢測資料Dout的加減運算後,作為各像素Px之顯示資料Din輸出。影像信號處理部54係使用實施加減運算後的顯示資料Din,產生各像素Px的不發光用灰階資料。 The video signal processing unit 54 reads the detection data Dout of each pixel Px stored in the storage unit 53. The video signal processing unit 54 performs addition and subtraction of the detection data Dout for each pixel Px for the light-emitting gray scale data of each pixel Px, and outputs it as display data Din for each pixel Px. The video signal processing unit 54 generates the grayscale data for non-light emission of each pixel Px by using the display data Din subjected to addition and subtraction.

[選擇驅動器20的構成] [Structure of Selecting Driver 20]

參照第16圖,說明選擇驅動器20的構成。此外,在電源驅動器30之選擇供給對象之候補的構成係與在選擇驅動器20之選擇選擇對象之候補的構成相同。因此,在以下,詳細說明選擇驅動器20的構成,而對電源驅動器30的構成省略說明。 The configuration of the selection driver 20 will be described with reference to Fig. 16. Further, the configuration of the candidate for selection of the power source driver 30 is the same as the configuration of the candidate for selection and selection of the selection driver 20. Therefore, the configuration of the selection driver 20 will be described in detail below, and the description of the configuration of the power source driver 30 will be omitted.

如第16圖所示,控制部50將檢測用位移時脈信號Clkr輸入至移位暫存器電路21。移位暫存器電路21係每當輸入檢測用位移時脈信號Clkr,就使在位移信號之一個選擇對象位元從與第1列至第m列逐列依序位移。 As shown in Fig. 16, the control unit 50 inputs the detection displacement clock signal Clkr to the shift register circuit 21. The shift register circuit 21 sequentially shifts one of the selection target bits of the displacement signal from the first column to the mth column column by column every time the detection displacement pulse signal Clkr is input.

控制部50將掩蔽脈衝信號MP輸入至移位暫存器電路21。在掩蔽脈衝信號MP是高位準時,移位暫存器電路21輸出位移信號。另一方面,在掩蔽脈衝信號MP是低位準時,移位暫存器電路21輸出不會含選擇對象位元之位移信號。而,在位移時脈信號係顯示用位移時脈信號Clks時,移位暫存器電路21係根據掩蔽脈衝信號MP是高位準,輸出包含選擇對象位元之位移信號。另一方面,在位移時脈信號係檢測用位移時脈信號Clkr時,移位暫存器電路21係在檢測期間以外,根據掩蔽脈衝信號MP是低位準,輸出不含選擇對象位元之位移信號。 The control unit 50 inputs the mask pulse signal MP to the shift register circuit 21. When the mask pulse signal MP is at a high level, the shift register circuit 21 outputs a shift signal. On the other hand, when the mask pulse signal MP is at a low level, the shift register circuit 21 outputs a shift signal which does not include the selection target bit. On the other hand, when the displacement clock signal is used to display the displacement clock signal Clks, the shift register circuit 21 outputs a displacement signal including the selected target bit based on the mask pulse signal MP being at a high level. On the other hand, when the displacement clock signal is used to detect the displacement clock signal Clkr, the shift register circuit 21 is outside the detection period, and according to the mask pulse signal MP, the position is low, and the displacement without the selection target bit is output. signal.

這種位移信號之輸出的控制係例如藉由對移位暫存器電路21之輸入端連接與位移信號之各位元對應的m個與電路(AND circuit),再在m個與電路之每一者輸入掩蔽脈衝信號MP,來實現。 The control of the output of the displacement signal is performed by, for example, connecting m AND circuits corresponding to the bits of the displacement signal to the input terminal of the shift register circuit 21, and then each of the m AND circuits The input of the masking pulse signal MP is implemented.

[資料驅動器40的構成] [Configuration of Data Driver 40]

參照第17圖,說明資料驅動器40的構成。 The configuration of the data drive 40 will be described with reference to Fig. 17.

如第17圖所示,資料鎖存電路43具備n個資料鎖存器43a、與n個資料鎖存器43a之每一者的輸入端連接的n個輸入開關SW1、及與n個資料鎖存器43a之每一者的輸出端連接的n個輸出開關SW2。又,資料鎖存電路43具備與第1行之輸出開關SW2及控制部50連接之傳輸開關SWtrs。 As shown in Fig. 17, the data latch circuit 43 is provided with n data latches 43a, n input switches SW1 connected to the input terminals of each of the n data latches 43a, and n data locks. The n output switches SW2 are connected to the output of each of the registers 43a. Further, the data latch circuit 43 includes a transfer switch SWtrs connected to the output switch SW2 of the first row and the control unit 50.

輸入開關SW1係根據來自控制部50之控制信號所驅動,而將第p行之資料鎖存器43a的輸入端與在資料暫存器電路42之第p行的暫存器、第p行的檢測用ADC44b、及第p+1行之資料鎖存器43a的輸出端之任一個連接。 The input switch SW1 is driven by a control signal from the control unit 50, and the input terminal of the data latch 43a of the p-th row is associated with the register of the p-th row of the data register circuit 42 and the p-th row. The detection ADC 44b and the output terminal of the data latch 43a of the p+1th row are connected.

在資料鎖存器43a的輸入端與資料暫存器電路42連接時,資料鎖存器43a係在與鎖存脈衝信號LP同步的時序,保持資料暫存器電路42所記憶之顯示資料Din。 When the input terminal of the data latch 43a is connected to the data register circuit 42, the material latch 43a holds the display data Din memorized by the data register circuit 42 at the timing synchronized with the latch pulse signal LP.

在資料鎖存器43a的輸入端與檢測用ADC44b連接時,資料鎖存器43a係在與鎖存脈衝信號LP同步的時序,將從檢測用ADC44b所輸出之資料作為檢測資料Dout保持。 When the input terminal of the data latch 43a is connected to the detection ADC 44b, the material latch 43a holds the data output from the detection ADC 44b as the detection data Dout at the timing synchronized with the latch pulse signal LP.

在第p行之資料鎖存器43a的輸入端與第p+1行之資料鎖存器43a的輸出端連接時,第p行之資料鎖存器43a係在與鎖存脈衝信號LP同步的時序,保持第p+1行之資料鎖存器43a所保持的檢測資料Dout。此外,係最後行之第n行的資料鎖存器43a係與邏輯電源60連接,並對 第n行的資料鎖存器43a施加邏輯基準電壓LVSS。 When the input terminal of the data latch 43a of the pth row is connected to the output terminal of the data latch 43a of the p+1th row, the data latch 43a of the pth row is synchronized with the latch pulse signal LP. Timing, the detection data Dout held by the data latch 43a of the p+1th row is held. In addition, the data latch 43a of the nth row of the last row is connected to the logic power source 60, and The data latch 43a of the nth row applies the logic reference voltage LVSS.

輸出開關SW2係根據來自控制部50之控制信 號所驅動,而將第p+1行之資料鎖存器43a的輸入端與電壓變換電路44之顯示用DAC44a、及第p行之資料鎖存器43a的輸入端之任一個連接。 The output switch SW2 is based on a control letter from the control unit 50. The signal is driven, and the input terminal of the data latch 43a of the p+1th row is connected to any one of the display DAC 44a of the voltage conversion circuit 44 and the input terminal of the data latch 43a of the p-th row.

在資料鎖存器43a的輸入端與電壓變換電路 44之顯示用DAC44a連接時,資料鎖存器43a所保持之顯示資料Din係在與鎖存脈衝信號LP同步的時序,輸入顯示用DAC44a。 At the input of the data latch 43a and the voltage conversion circuit When the display of 44 is connected by the DAC 44a, the display data Din held by the data latch 43a is input to the display DAC 44a at the timing synchronized with the latch pulse signal LP.

在第p+1行之資料鎖存器43a的輸出端與第p 行之資料鎖存器43a的輸入端連接時,第p+1行之資料鎖存器43a所保持的檢測資料Dout係在與鎖存脈衝信號LP同步的時序,由第p行之資料鎖存器43a所保持。 At the output of the data latch 43a of the p+1th row and the pth When the input terminal of the data latch 43a is connected, the detected data Dout held by the data latch 43a of the p+1th row is at the timing synchronized with the latch pulse signal LP, and is latched by the data of the pth row. The device 43a is held.

傳輸開關SWtrs係根據來自控制部50之控制 信號所驅動,而切換第1行之資料鎖存器43a與控制部50的連接和切斷。在第1行之資料鎖存器43a與控制部50連接時,第1行之資料鎖存器43a所保持的檢測資料Dout係向控制部50輸出。 The transmission switch SWtrs is controlled according to the control unit 50 The signal is driven to switch the connection and disconnection of the data latch 43a of the first row from the control unit 50. When the data latch 43a of the first row is connected to the control unit 50, the detection data Dout held by the material latch 43a of the first row is output to the control unit 50.

電壓變換電路44具備n個顯示用DAC44a與係 類比-數位變換電路之n個檢測用ADC44b。n個檢測用ADC44b之每一者係將從與該檢測用ADC44b連接之緩衝電路45所輸入的類比電壓變換成例如8位元的檢測資料Dout後,將檢測資料Dout輸出至與該檢測用ADC44b連接的資料鎖存器43a。檢測用ADC44b係對所輸入之類比電壓,在所輸出之數位資料具有線性。在顯示用DAC44a 與檢測用ADC44b,作為電壓變換時之數位資料的位元長度,被設定係例如8位元之同一位元長度。 The voltage conversion circuit 44 includes n display DACs 44a and systems The n detection ADCs 44b of the analog-to-digital conversion circuit. Each of the n detection ADCs 44b converts the analog voltage input from the buffer circuit 45 connected to the detection ADC 44b into, for example, 8-bit detection data Dout, and outputs the detection data Dout to the detection ADC 44b. The connected data latch 43a. The analog voltage input to the ADC44b for detection is linear in the digital data output. In the display with DAC44a The bit length of the digital data at the time of voltage conversion with the detection ADC 44b is set to be, for example, the same bit length of 8 bits.

緩衝電路45具備各資料線Ld之緩衝器45a、各 資料線Ld之緩衝器45b及切換資料線Ld與緩衝器45a之連接和切斷之各資料線Ld的顯示用開關SWd。又,緩衝電路45具備切換資料線Ld與緩衝器45b之連接和切斷之各資料線Ld的檢測用開關SWm、及切換資料線Ld與類比電源70之連接和切斷之各資料線Ld的檢測用電壓開關SWs。 The buffer circuit 45 includes a buffer 45a for each data line Ld, and each The buffer 45b of the data line Ld and the display switch SWd for switching the data line Ld to the buffer 45a and the data lines Ld for cutting. Further, the buffer circuit 45 includes a detection switch SWm for switching between the data line Ld and the buffer 45b and each of the data lines Ld, and a data line Ld for connecting and disconnecting the data line Ld and the analog power source 70. Detection voltage switch SWs.

顯示用開關SWd係根據來自控制部50之控制 信號所驅動,連接緩衝器45a與資料線Ld,而從緩衝器45a對資料線Ld施加發光電壓VD及不發光電壓VDN。緩衝器45b係取入資料線Ld之電壓,再將所取入之電壓放大至檢測用ADC44b的驅動位準後,向檢測用ADC44b輸出。檢測用開關SWm係根據來自控制部50之控制信號所驅動,連接緩衝器45b與資料線Ld,而將資料線Ld之電壓取入緩衝器45b。檢測用電壓開關SWs控制從類比電源70對資料線Ld之檢測用電壓VM的施加。 The display switch SWd is controlled according to the control unit 50. The signal is driven to connect the buffer 45a and the data line Ld, and the light-emitting voltage VD and the non-light-emitting voltage VDN are applied from the buffer 45a to the data line Ld. The buffer 45b takes in the voltage of the data line Ld, amplifies the taken-in voltage to the driving level of the detecting ADC 44b, and outputs it to the detecting ADC 44b. The detection switch SWm is driven by a control signal from the control unit 50, and connects the buffer 45b and the data line Ld, and takes the voltage of the data line Ld into the buffer 45b. The detection voltage switch SWs controls the application of the detection voltage VM from the analog power source 70 to the data line Ld.

n個資料鎖存器43a之每一者的輸入端係在發 光期間及不發光期間,與在資料暫存器電路42之對應的暫存器連接。n個資料鎖存器43a之每一者係保持對應之暫存器所記憶的灰階資料,並使該保持與鎖存脈衝信號LP同步。n個資料鎖存器43a之每一者係向電壓變換電路44輸出該資料鎖存器43a所保持之顯示資料Din。藉此,資料鎖存電路43係每當輸入鎖存脈衝信號LP,就保持資 料暫存器電路42所取入之一列份的顯示資料Din,並向電壓變換電路44輸出所保持之一列份的顯示資料Din。 The input of each of the n data latches 43a is in the hair The optical period and the non-lighting period are connected to the corresponding register in the data register circuit 42. Each of the n data latches 43a holds gray scale data stored in the corresponding scratchpad and synchronizes the hold with the latch pulse signal LP. Each of the n data latches 43a outputs the display material Din held by the material latch 43a to the voltage conversion circuit 44. Thereby, the data latch circuit 43 maintains the capital every time the latch pulse signal LP is input. The material register circuit 42 takes in a display data Din of one of the columns, and outputs the display data Din of one of the held columns to the voltage conversion circuit 44.

n個資料鎖存器43a之每一者的輸入端係在檢 測動作,與在顯示用DAC/ADC44之對應的檢測用ADC44b連接。n個資料鎖存器43a之每一者係將從對應之檢測用ADC44b所輸出的資料作為檢測資料Dout來保持,並使該保持與鎖存脈衝信號LP同步。 The input of each of the n data latches 43a is inspected The measurement operation is connected to the detection ADC 44b corresponding to the display DAC/ADC 44. Each of the n data latches 43a holds the data output from the corresponding detection ADC 44b as the detection data Dout, and synchronizes the hold with the latch pulse signal LP.

第p行(1≦p≦n)之資料鎖存器43a的輸入端 係在檢測動作,與第p+1行之資料鎖存器43a的輸出端連接。第p行之資料鎖存器43a的每一者係將第p+1行之資料鎖存器43a所保持的資料作為檢測資料Dout來保持,並使該保持與鎖存脈衝信號LP同步。 Input of the data latch 43a of the pth row (1≦p≦n) It is connected to the output of the data latch 43a of the p+1th line in the detection operation. Each of the data latches 43a of the p-th row holds the data held by the data latch 43a of the p+1th row as the detection data Dout, and synchronizes the hold with the latch pulse signal LP.

第1行之資料鎖存器43a的輸出端係在檢測動 作,與控制部50連接,並向控制部50輸出第1行之資料鎖存器43a所保持的檢測資料Dout。藉此,第1行之資料鎖存器43a係從第2行之資料鎖存器43a依序保持第p+1行之資料鎖存器43a所保持的全部資料,並依序向控制部50輸出該保持之資料。 The output of the data latch 43a of the first row is detected The control unit 50 is connected to the control unit 50, and outputs the detection data Dout held by the data latch 43a of the first row. Thereby, the data latch 43a of the first row sequentially holds all the data held by the data latch 43a of the p+1th row from the data latch 43a of the second row, and sequentially proceeds to the control section 50. Output the retained data.

[EL顯示裝置之作用] [The role of EL display device]

參照第18圖~第25圖,說明EL顯示裝置之發光期間的動作、及包含檢測動作之EL顯示裝置之不發光期間的動作。首先,說明EL顯示裝置之發光期間的動作。 The operation of the EL display device during the light-emitting period and the operation of the EL display device including the detection operation during the non-light-emitting period will be described with reference to FIGS. 18 to 25. First, the operation during the light emission period of the EL display device will be described.

[發光期間] [lighting period]

參照第18圖,說明在發光期間之選擇驅動器20、電源驅動器30及資料驅動器40之驅動狀態的變遷。在發光 期間中,與第1實施形態及第2實施形態一樣,依序進行發光用之寫入操作及發光操作。 Referring to Fig. 18, the transition of the driving states of the selection driver 20, the power source driver 30, and the data driver 40 during the light emission period will be described. Glowing In the same manner as in the first embodiment and the second embodiment, the writing operation and the light-emitting operation for light emission are sequentially performed.

如第18圖所示,在發光期間,控制部50將檢 測用開關SWm、檢測用電壓開關SWs及傳輸開關SWtrs保持關閉(off)。又,控制部50係在資料鎖存器43a與顯示用DAC44a連接之狀態,保持輸出開關SW2,而在資料鎖存器43a與資料暫存器電路42連接之狀態,保持輸入開關SW1。而且,控制部50係與在第1實施形態之發光期間一樣,控制起動脈衝信號SP1之輸入、起動脈衝信號SP2之輸入及鎖存脈衝信號LP之輸入。 As shown in Fig. 18, during illumination, the control unit 50 will check The measurement switch SWm, the detection voltage switch SWs, and the transfer switch SWtrs are kept off. Moreover, the control unit 50 holds the output switch SW2 while the data latch 43a is connected to the display DAC 44a, and holds the input switch SW1 in a state where the material latch 43a is connected to the data register circuit 42. Further, the control unit 50 controls the input of the start pulse signal SP1, the input of the start pulse signal SP2, and the input of the latch pulse signal LP, as in the light-emitting period of the first embodiment.

即,在時序tk1,控制部50係將顯示用開關 SWd切換成打開(on),而將移位暫存器電路41、資料暫存器電路42、資料鎖存器43a、顯示用DAC44a、緩衝器45a及資料線Ld串接。 That is, at the timing tk1, the control unit 50 sets the display switch SWd is switched on, and the shift register circuit 41, the data register circuit 42, the data latch 43a, the display DAC 44a, the buffer 45a, and the data line Ld are connected in series.

在時序tk2,控制部50係將起動脈衝信號SP1 輸入至資料驅動器40,使資料暫存器電路42取入第1列之顯示資料Din。然後,控制部50將起動脈衝信號SP2輸入至選擇驅動器20及電源驅動器30。 At timing tk2, the control unit 50 sets the start pulse signal SP1. The data driver 40 is input to the data register circuit 42 to take in the display data Din of the first column. Then, the control unit 50 inputs the start pulse signal SP2 to the selection driver 20 and the power source driver 30.

在時序tk3,控制部50係對第1列之掃描線Ls 施加選擇電壓VgH,而且對第1列之電源線La施加寫入電壓WDVSS。在此時,控制部50係將鎖存脈衝信號LP輸入至資料驅動器40,使資料鎖存器43a同時保持第1列之顯示資料Din。資料鎖存器43a所保持之第1列的顯示資料Din係作為是類比電壓之發光電壓VD,被輸入至資料線Ld。藉此,控制部50結束對第1列之像素Px之發光用的寫 入操作。在此時,控制部50係再將起動脈衝信號SP1輸入至資料驅動器40,使資料暫存器電路42取入第2列之顯示資料Din。 At timing tk3, the control unit 50 is for the scan line Ls of the first column. The selection voltage VgH is applied, and the write voltage WDVSS is applied to the power line La of the first column. At this time, the control unit 50 inputs the latch pulse signal LP to the data driver 40, and causes the material latch 43a to simultaneously hold the display data Din of the first column. The display data Din of the first column held by the data latch 43a is input to the data line Ld as the light-emission voltage VD which is the analog voltage. Thereby, the control unit 50 ends the writing for light emission of the pixel Px of the first column. Into the operation. At this time, the control unit 50 further inputs the start pulse signal SP1 to the data driver 40, and causes the data register circuit 42 to take in the display data Din of the second column.

此外,控制部50係將對第1列之像素Px被賦予 對應的檢測資料Dout與成為基準之臨限值電壓Vth的差分當作修正值來處理。而且,控制部50係對調整後之發光用灰階資料進行修正值的加減運算,並將該運算結果作為施加於各資料線Ld的發光電壓VD。 Further, the control unit 50 will assign the pixel Px of the first column. The difference between the corresponding detection data Dout and the threshold voltage Vth serving as the reference is treated as a correction value. Further, the control unit 50 performs addition and subtraction of the correction value on the adjusted gray scale data for illumination, and uses the calculation result as the light emission voltage VD applied to each of the data lines Ld.

在時序tk4,控制部50係對第1列之掃描線Ls 施加非選擇電壓VgL,而且對第1列之電源線La施加驅動電壓ELVDD。然後,第1列之驅動電晶體Tr3的每一者係將因應於第1列之保持電容Cs所保持的寫入電壓與在其所連接之驅動電晶體Tr3的臨限值電壓Vth之差的汲極電流供給至對應的EL元件11。在此時,在施加於各資料線Ld之發光電壓VD中,因為臨限值電壓Vth之變動量被修正,所以供給至EL元件11之汲極電流亦被修正了臨限值電壓Vth的變動量。藉此,控制部50結束對第1列之像素Px的發光期間。 At timing tk4, the control unit 50 is directed to the scan line Ls of the first column. The non-selection voltage VgL is applied, and the driving voltage ELVDD is applied to the power line La of the first column. Then, each of the drive transistors Tr3 of the first column is caused by the difference between the write voltage held by the storage capacitor Cs of the first column and the threshold voltage Vth of the drive transistor Tr3 to which it is connected. The drain current is supplied to the corresponding EL element 11. At this time, in the light-emission voltage VD applied to each data line Ld, since the fluctuation amount of the threshold voltage Vth is corrected, the drain current supplied to the EL element 11 is also corrected by the fluctuation of the threshold voltage Vth. the amount. Thereby, the control unit 50 ends the light-emitting period for the pixel Px of the first column.

此外,在此時,控制部50係對第2列之掃描線Ls施加選擇電壓VgH,而且對第2列之電源線La施加寫入電壓WDVSS。又,控制部50係再將鎖存脈衝信號LP輸入至資料驅動器40,使各資料鎖存器43a保持第2列之顯示資料Din。資料鎖存器43a所保持之第2列的顯示資料Din係作為是類比電壓之發光電壓VD,被輸入至資料線Ld。藉此,控制部50結束對第2列之像素Px之發光用的寫入操 作。以後,對各列依序進行發光用之寫入操作與發光操作,這種發光期間從第1列至第n列按照顯示用時脈週期重複。 Further, at this time, the control unit 50 applies the selection voltage VgH to the scanning line Ls of the second column, and applies the writing voltage WDVSS to the power line La of the second column. Further, the control unit 50 further inputs the latch pulse signal LP to the data driver 40, and causes each of the material latches 43a to hold the display data Din of the second column. The display data Din of the second column held by the data latch 43a is input to the data line Ld as the light-emission voltage VD which is the analog voltage. Thereby, the control unit 50 ends the writing operation for the light emission of the pixel Px of the second column. Work. Thereafter, the writing operation and the light-emitting operation for light emission are sequentially performed for each column, and the light-emitting period is repeated from the first column to the nth column in accordance with the display clock cycle.

[不發光期間] [No light period]

參照第19圖至第22圖,說明EL顯示裝置之在不發光期間的選擇驅動器20、電源驅動器30及資料驅動器40之驅動狀態的變遷。在不發光期間,依序進行不發光用之寫入操作、不發光操作及檢測動作。此外,第19圖係表示在不發光用之寫入操作及不發光操作的選擇驅動器20、電源驅動器30及資料驅動器40之驅動狀態的變遷,第21圖係表示在檢測動作之選擇驅動器20、電源驅動器30及資料驅動器40之驅動狀態的變遷。 Referring to Figs. 19 to 22, the transition of the driving state of the selection driver 20, the power source driver 30, and the data driver 40 during the period in which the EL display device is not illuminated will be described. During the non-lighting period, the writing operation, the non-lighting operation, and the detecting operation for non-lighting are sequentially performed. In addition, FIG. 19 shows changes in the driving states of the selection driver 20, the power source driver 30, and the data driver 40 for the writing operation and the non-lighting operation for non-light-emitting, and FIG. 21 shows the selection driver 20 for detecting the operation, The change in the driving state of the power driver 30 and the data driver 40.

如第19圖所示,在進行不發光用之寫入操作及不發光操作的期間,控制部50係接著發光期間,將檢測用開關SWm、檢測用電壓開關SWs及傳輸開關SWtrs保持關閉。又,控制部50係在資料鎖存器43a與顯示用DAC44a連接之狀態,保持輸出開關SW2,而在資料鎖存器43a與資料暫存器電路42連接之狀態,保持輸入開關SW1。又,控制部50係將顯示用開關SWd保持打開,而將移位暫存器電路41、資料暫存器電路42、資料鎖存器43a、顯示用DAC44a、緩衝器45a及資料線Ld持續串接。而且,控制部50係與在第1實施形態之不發光用的寫入操作及不發光操作一樣,輸入起動脈衝信號SP1、起動脈衝信號SP2及鎖存脈衝信號LP。 As shown in FIG. 19, while the writing operation and the non-lighting operation for non-lighting are performed, the control unit 50 keeps the detection switch SWm, the detection voltage switch SWs, and the transmission switch SWtrs off during the subsequent light emission period. Moreover, the control unit 50 holds the output switch SW2 while the data latch 43a is connected to the display DAC 44a, and holds the input switch SW1 in a state where the material latch 43a is connected to the data register circuit 42. Further, the control unit 50 keeps the display switch SWd open, and continues the shift register circuit 41, the data register circuit 42, the data latch 43a, the display DAC 44a, the buffer 45a, and the data line Ld. Pick up. Further, the control unit 50 inputs the start pulse signal SP1, the start pulse signal SP2, and the latch pulse signal LP in the same manner as the write operation and the non-light-emitting operation for non-light-emitting in the first embodiment.

即,在時序tj1,控制部50係將起動脈衝信號 SP1輸入至資料驅動器40,使資料暫存器電路42取入第1列之顯示資料Din。然後,控制部50將起動脈衝信號SP2輸入至選擇驅動器20及電源驅動器30。 That is, at the timing tj1, the control unit 50 will start the pulse signal. SP1 is input to the data driver 40, and causes the data register circuit 42 to take in the display data Din of the first column. Then, the control unit 50 inputs the start pulse signal SP2 to the selection driver 20 and the power source driver 30.

在時序tj2,控制部50係對第1列之掃描線Ls 施加選擇電壓VgH,而且對第1列之電源線La施加寫入電壓WDVSS。在此時,控制部50係將鎖存脈衝信號LP輸入至資料驅動器40,使資料鎖存器43a同時保持第1列之顯示資料Din。資料鎖存器43a所保持之第1列的顯示資料Din係作為是類比電壓之不發光電壓VDN,被輸入至資料線Ld。藉此,控制部50係對第1列之各像素Px,前面之發光電壓VD愈高的像素Px時使保持愈低的閘極-源極間電壓Vgs,並結束對第1列之像素Px之不發光用的寫入操作。在此時,控制部50係再將起動脈衝信號SP1輸入至資料驅動器40,使資料暫存器電路42取入第2列之顯示資料Din。 At the timing tj2, the control unit 50 is directed to the scanning line Ls of the first column. The selection voltage VgH is applied, and the write voltage WDVSS is applied to the power line La of the first column. At this time, the control unit 50 inputs the latch pulse signal LP to the data driver 40, and causes the material latch 43a to simultaneously hold the display data Din of the first column. The display data Din of the first column held by the data latch 43a is input to the data line Ld as the non-light-emitting voltage VDN which is the analog voltage. Thereby, the control unit 50 terminates the gate-source voltage Vgs which is kept lower as the pixel Px of the first column and the pixel Px having the higher front surface light-emitting voltage VD, and ends the pixel Px for the first column. A write operation that does not emit light. At this time, the control unit 50 further inputs the start pulse signal SP1 to the data driver 40, and causes the data register circuit 42 to take in the display data Din of the second column.

此外,控制部50係將對第1列之像素Px被賦予 對應的檢測資料Dout與成為基準之臨限值電壓Vth的差分當作修正值來處理。而且,控制部50係將已加進修正值後之不發光電壓VDN施加於各資料線Ld。 Further, the control unit 50 will assign the pixel Px of the first column. The difference between the corresponding detection data Dout and the threshold voltage Vth serving as the reference is treated as a correction value. Further, the control unit 50 applies the non-light-emitting voltage VDN to which the correction value has been added to each of the data lines Ld.

在時序tj3,控制部50係對第1列之掃描線Ls 施加非選擇電壓VgL,而且對第1列之電源線La持續施加寫入電壓WDVSS。藉此,控制部50係對第1列之驅動電晶體Tr3持續施加第1列之保持電容Cs所保持的寫入電壓,即,前面之發光電壓VD愈高之像素時愈低的閘極-源極間電壓Vgs。藉此,控制部50結束對第1列之像素Px的 不發光操作。 At timing tj3, the control unit 50 is for the scan line Ls of the first column. The non-selection voltage VgL is applied, and the write voltage WDVSS is continuously applied to the power supply line La of the first column. Thereby, the control unit 50 continues to apply the write voltage held by the storage capacitor Cs of the first column to the drive transistor Tr3 of the first column, that is, the gate which is lower as the pixel having the higher front emission voltage VD is lower - Source-to-source voltage Vgs. Thereby, the control unit 50 ends the pixel Px of the first column. No light operation.

此外,在此時,控制部50係對第2列之掃描線 Ls施加選擇電壓VgH,而且對第2列之電源線La施加寫入電壓WDVSS。又,控制部50係再將鎖存脈衝信號LP輸入至資料驅動器40,使各資料鎖存器43a保持第2列之顯示資料Din。資料鎖存器43a所保持之第2列的顯示資料Din係作為是類比電壓之不發光電壓VDN,被輸入至資料線Ld。藉此,控制部50結束對第2列之像素Px之不發光用的寫入操作。以後,依各列依序進行不發光用之寫入操作與不發光操作,這種不發光用之寫入操作與不發光操作從第1列至第n列按照顯示用時脈週期重複。 Further, at this time, the control unit 50 is for the scan line of the second column. The selection voltage VgH is applied to Ls, and the write voltage WDVSS is applied to the power supply line La of the second column. Further, the control unit 50 further inputs the latch pulse signal LP to the data driver 40, and causes each of the material latches 43a to hold the display data Din of the second column. The display data Din of the second column held by the data latch 43a is input to the data line Ld as the non-light-emitting voltage VDN which is the analog voltage. Thereby, the control unit 50 ends the writing operation for the non-light-emitting of the pixel Px of the second column. Thereafter, the writing operation and the non-lighting operation for non-lighting are sequentially performed for each column, and the writing operation and the non-lighting operation for non-lighting are repeated from the first column to the nth column in accordance with the display clock cycle.

其次,說明在檢測動作之選擇驅動器20、電 源驅動器30及資料驅動器40之驅動狀態的變遷。首先,參照第20圖,說明驅動電晶體Tr3之對汲極電流之發光電壓VD的相依性。此外,在第20圖,舉例表示在驅動電晶體Tr3之臨限值電壓Vth彼此相異的2個驅動電晶體Tr3之該相依性。 Next, the selection driver 20 and the electric power in the detection operation will be described. The transition of the drive state of the source driver 30 and the data driver 40. First, the dependence of the driving transistor Tr3 on the illuminating voltage VD of the drain current will be described with reference to Fig. 20. Further, in Fig. 20, the dependence of the two drive transistors Tr3 having the threshold voltages Vth of the drive transistor Tr3 different from each other is exemplified.

在第20圖以實線所表示的曲線L1表示驅動電 晶體Tr3之對汲極電流Id之發光電壓VD的相依性,表示驅動電晶體Tr3之臨限值電壓Vth與在驅動電路PCC之電流放大率β係起始值時的相依性。若將臨限值電壓Vth之起始值設為Vth0,則在起始狀態之驅動電路PCC流動的汲極電流Id係以如下之數學式(1)表示。此外,V0係寫入電壓WDVSS。 The curve L1 indicated by the solid line in Fig. 20 indicates the dependence of the driving transistor Tr3 on the illuminating voltage VD of the drain current Id, and indicates the threshold voltage Vth of the driving transistor Tr3 and the current amplification at the driving circuit PCC. The dependence of the rate β on the initial value. When the start value of the threshold voltage Vth is Vth 0 , the drain current Id flowing in the drive circuit PCC in the initial state is expressed by the following mathematical expression (1). Further, V 0 is a write voltage WDVSS.

Id=β(V0-Vd-Vth0)2…(1) Id=β(V 0 -Vd-Vth 0 ) 2 (1)

在第20圖以虛線所表示的曲線L2表示驅動電晶體Tr3之對汲極電流Id之發光電壓VD的相依性,表示驅動電晶體Tr3之汲極電流Id因隨著時間而從起始狀態變化時。若將臨限值電壓Vth設為Vth1(=Vth0+△Vth),則在此狀態之驅動電路PCC流動的汲極電流Id係以如下之數學式(2)表示。 The curve L2 indicated by a broken line in Fig. 20 indicates the dependence of the driving transistor Tr3 on the illuminating voltage VD of the drain current Id, and indicates that the drain current Id of the driving transistor Tr3 changes from the initial state with time. Time. When the threshold voltage Vth is Vth 1 (= Vth0 + ΔVth), the drain current Id flowing in the drive circuit PCC in this state is expressed by the following mathematical expression (2).

Id=β(V0-Vd-Vth1)2…(2) Id=β(V 0 -Vd-Vth 1 ) 2 (2)

如第20圖、及上述之數學式(1)、(2)所示,曲線L2係表示曲線L1僅平移位移量△Vth的形狀,在臨限值電壓Vth之變動的前後,這些曲線L1與曲線L2的形狀係幾乎不變。這暗示與臨限值電壓Vth之變動相比,電流放大率β之變動係可忽略的程度,而且藉由使用在驅動電晶體Tr3之位移量△Vth修正發光電壓VD,而修正驅動電晶體Tr3之汲極電流Id。第2實施形態之EL顯示裝置係在臨限值電壓Vth之檢測動作,檢測出這種驅動電晶體Tr3之臨限值電壓Vth,並修正被施加於驅動電路PCC的發光電壓VD。 As shown in Fig. 20 and the above mathematical expressions (1) and (2), the curve L2 indicates the shape of the curve L1 which is only shifted by the displacement amount ΔVth, and these curves L1 and before and after the fluctuation of the threshold voltage Vth The shape of the curve L2 is almost constant. This implies that the variation of the current amplification factor β is negligible compared to the variation of the threshold voltage Vth, and the drive transistor Tr3 is corrected by correcting the emission voltage VD by using the displacement amount ΔVth of the drive transistor Tr3. The drain current Id. In the EL display device of the second embodiment, the threshold voltage Vth of the drive transistor Tr3 is detected and the illuminating voltage VD applied to the drive circuit PCC is corrected.

參照第21圖,說明在檢測動作之選擇驅動器20、電源驅動器30及資料驅動器40之驅動狀態的變遷。在檢測動作,依序進行電壓保持動作、電壓飽和動作、電壓測量動作及電壓輸出動作。此外,臨限值電壓Vth之檢測動作係因為像素Px所排列之各列彼此相等,所以在以下,舉例說明成為檢測對象之列為第q列的情況。 Referring to Fig. 21, the transition of the driving state of the selection driver 20, the power driver 30, and the data driver 40 in the detection operation will be described. In the detection operation, the voltage holding operation, the voltage saturation operation, the voltage measurement operation, and the voltage output operation are sequentially performed. In addition, since the detection operation of the threshold voltage Vth is equal to each other in the columns in which the pixels Px are arranged, the case where the column to be detected is the qth column will be exemplified below.

如第21圖之下側所示,在進行第q列之像素Px之檢測動作的期間,控制部50對第q列之電源線La持續施 加寫入電壓WDVSS。又,控制部50係將顯示用開關SWd保持關閉,而從移位暫存器電路41及資料暫存器電路42將第q列之驅動電路PCC持續斷路。又,控制部50將輸出開關SW2與鄰接之其他的資料鎖存器43a持續連接。 As shown in the lower side of FIG. 21, during the detection operation of the pixel Px in the qth column, the control unit 50 continues to apply the power line La of the qth column. Add write voltage WDVSS. Moreover, the control unit 50 keeps the display switch SWd closed, and continuously disconnects the drive circuit PCC of the qth column from the shift register circuit 41 and the data register circuit 42. Further, the control unit 50 continuously connects the output switch SW2 to the adjacent material latch 43a.

在時序t1,控制部50係將輸入開關SW1與檢 測用ADC44b連接,而且將傳輸開關SWtrs維持關閉。在此狀態,控制部50係對第q列之掃描線Ls施加選擇電壓VgH,而將第q列之切換電晶體Tr2與第q列之取樣電晶體Tr1設為導通狀態,並將第q列之驅動電晶體Tr3改變成在飽和區域驅動之狀態。又,控制部50係將檢測用電壓開關SWs切換成打開,而從類比電源70同時對各資料線Ld施加檢測用電壓VM。 At timing t1, the control unit 50 will input the switch SW1 and check The ADC44b is connected and the transfer switch SWtrs is kept off. In this state, the control unit 50 applies the selection voltage VgH to the scanning line Ls of the qth column, and sets the switching transistor Tr2 of the qth column and the sampling transistor Tr1 of the qth column to the on state, and sets the qth column. The driving transistor Tr3 is changed to a state of being driven in a saturation region. Moreover, the control unit 50 switches the detection voltage switch SWs to ON, and simultaneously applies the detection voltage VM to each of the data lines Ld from the analog power supply 70.

在此時,以將比所設想之臨限值電壓Vth更高 的電壓作為閘極-源極間電壓Vgs施加的方式,預設檢測用電壓VM。即,為了寫入電壓WDVSS與檢測用電壓VM之差比所設想之臨限值電壓Vth更大,控制部50將檢測用電壓VM施加於驅動電晶體Tr3之閘極-源極間。此外,被施加檢測用電壓VM之各資料線Ld的電位係比寫入電壓WDVSS更低位準,而且,比EL元件11之陰極更低位準。 At this time, to be higher than the assumed threshold voltage Vth The voltage is applied as a gate-source voltage Vgs, and the detection voltage VM is preset. That is, in order to make the difference between the write voltage WDVSS and the detection voltage VM larger than the threshold voltage Vth assumed, the control unit 50 applies the detection voltage VM between the gate and the source of the drive transistor Tr3. Further, the potential of each of the data lines Ld to which the detection voltage VM is applied is lower than the write voltage WDVSS, and is lower than the cathode of the EL element 11.

檢測用電壓VM被施加於各資料線Ld時,因應 於檢測用電壓VM與寫入電壓WDVSS之差之各像素Px的電流經由第q列之驅動電晶體Tr3與第q列之取樣電晶體Tr1,向類比電源70流動。在第q列之保持電容Cs伴隨此,保持驅動電晶體Tr3之閘極-源極間電壓Vgs,藉此,電壓保持動作結束。此外,因為EL元件11之陽極的電位係 比EL元件11之陰極的電位更低位準,所以EL元件11不發光。 When the detection voltage VM is applied to each data line Ld, the corresponding The current of each pixel Px between the detection voltage VM and the write voltage WDVSS flows to the analog power source 70 via the drive transistor Tr3 of the qth column and the sampling transistor Tr1 of the qth column. Accordingly, the gate-source voltage Vgs of the driving transistor Tr3 is maintained while the holding capacitance Cs of the qth column is maintained, whereby the voltage holding operation is completed. In addition, because the potential of the anode of the EL element 11 is The potential of the cathode of the EL element 11 is lower than that of the EL element 11, so that the EL element 11 does not emit light.

在時序t2,控制部50係對第q列之掃描線Ls 保持選擇電壓VgH的施加,又,一面保持檢測用開關SWm之關閉,一面僅將檢測用電壓開關SWs切換成關閉。藉此,各資料線Ld中比與取樣電晶體Tr1連接之部位更接近資料驅動器40的部位切換成高阻抗(high impedance)狀態。 At timing t2, the control unit 50 is paired with the scan line Ls of the qth column. While the application of the selection voltage VgH is maintained, the detection voltage switch SWs is switched to off only while the detection switch SWm is turned off. Thereby, the portion of each of the data lines Ld that is closer to the data driver 40 than the portion to which the sampling transistor Tr1 is connected is switched to a high impedance state.

在此時,第q列之保持電容Cs係因保持第q列 之驅動電晶體Tr3的閘極-源極間電壓Vgs,所以在第q列之驅動電晶體Tr3,以第q列之驅動電晶體Tr3之源極的電位接近第q列之驅動電晶體Tr3之汲極的電位的方式,汲極電流流動。然後,是從時序t2所經過之時間的緩和時間t愈前進,第q列之保持電容Cs係將電荷愈放電,而第q列之保持電容Cs之兩端間的電壓,即在第q列之驅動電晶體Tr3的閘極-源極間電壓Vgs降低至汲極電流變成不流動的臨限值電壓Vth。 At this time, the holding capacitor Cs of the qth column is maintained by the qth column. Since the gate-source voltage Vgs of the transistor Tr3 is driven, in the driving transistor Tr3 of the qth column, the potential of the source of the driving transistor Tr3 of the qth column is close to the driving transistor Tr3 of the qth column. In the way of the potential of the bungee, the bungee current flows. Then, the relaxation time t from the time elapsed from the timing t2 advances, and the holding capacitance Cs of the qth column discharges the electric charge, and the voltage between the both ends of the holding capacitance Cs of the qth column, that is, the qth column The gate-source voltage Vgs of the driving transistor Tr3 is lowered to a threshold voltage Vth at which the drain current becomes non-flowing.

結果,第q列之保持電容Cs係保持相當於第q 列之驅動電晶體Tr3之臨限值電壓Vth的電壓,而電壓飽和動作結束。此外,控制部50係在時序t2以後將用以對各資料線Ld施加檢測用電壓VM之檢測用開關SWm保持關閉。 As a result, the holding capacitor Cs of the qth column remains equal to the qth The voltage of the threshold voltage Vth of the driving transistor Tr3 is listed, and the voltage saturation operation ends. Further, the control unit 50 holds the detection switch SWm for applying the detection voltage VM to each of the data lines Ld to be turned off after the timing t2.

在時序t3,控制部50係對第q列之掃描線Ls 保持選擇電壓VgH之施加,又,僅將檢測用開關SWm切換成打開。藉此,資料線Ld與檢測用ADC44b連接,係高 阻抗狀態之資料線Ld的電位被取入檢測用ADC44b。 At timing t3, the control unit 50 is paired with the scan line Ls of the qth column. The application of the selection voltage VgH is maintained, and only the detection switch SWm is switched to be turned on. Thereby, the data line Ld is connected to the detection ADC 44b, and is high. The potential of the data line Ld of the impedance state is taken in the detection ADC 44b.

在此時,第q列之保持電容Cs保持相當於第q 列之驅動電晶體Tr3之臨限值電壓Vth的電壓。因此,從檢測用ADC44b所取入之電位與寫入電壓WDVSS的電位差,檢測出在第q列之驅動電晶體Tr3的閘極-源極間電壓Vgs,即,對應於第q列之驅動電晶體Tr3之臨限值電壓Vth的電壓。檢測用ADC44b所取入之資料線Ld的電位係藉檢測用ADC44b變換成係數位資料的檢測資料Dout後,經由位準位移器46b,向資料鎖存器43a輸出。然後,資料鎖存器43a保持檢測資料Dout,藉此,電壓量測動作結束。 At this time, the holding capacitor Cs of the qth column remains equal to the qth The voltage of the threshold voltage Vth of the drive transistor Tr3 is listed. Therefore, the gate-source voltage Vgs of the drive transistor Tr3 in the qth column, that is, the drive power corresponding to the qth column, is detected from the potential difference between the potential taken in by the detection ADC 44b and the write voltage WDVSS. The voltage of the threshold voltage Vth of the crystal Tr3. The potential of the data line Ld taken in by the detection ADC 44b is converted into the detection data Dout of the coefficient bit data by the detection ADC 44b, and then output to the data latch 43a via the level shifter 46b. Then, the material latch 43a holds the detection data Dout, whereby the voltage measurement operation ends.

在時序t4,控制部50係對第q列之掃描線Ls 施加非選擇電壓VgL,而將第q列之切換電晶體Tr2與第q列之取樣電晶體Tr1切換成非導通狀態。在此狀態,控制部50係將檢測用開關SWm切換成關閉,而且將傳輸開關SWtrs切換成打開。進而,控制部50係將輸入開關SW1與鄰接之資料鎖存器43a連接,而將各資料鎖存器43a串接。 At timing t4, the control unit 50 is paired with the scan line Ls of the qth column. The non-selection voltage VgL is applied, and the switching transistor Tr2 of the qth column and the sampling transistor Tr1 of the qth column are switched to a non-conduction state. In this state, the control unit 50 switches the detection switch SWm to off, and switches the transmission switch SWtrs to ON. Further, the control unit 50 connects the input switch SW1 to the adjacent material latch 43a, and connects the respective material latches 43a in series.

在此時,控制部50係將鎖存脈衝信號LP輸入 至資料驅動器40,並以與鎖存脈衝信號LP之時序同步的方式依序傳輸各資料鎖存器43a所保持之檢測資料Dout。藉此,控制部50將關於第q列之驅動電晶體Tr3的每一者之臨限值電壓Vth的資料依序傳輸至資料驅動器40。此外,在第21圖,為了便於說明驅動狀態的變遷,表示成省略鎖存脈衝信號LP之重複次數。 At this time, the control unit 50 inputs the latch pulse signal LP. To the data driver 40, the detected data Dout held by each of the material latches 43a is sequentially transferred in synchronization with the timing of the latch pulse signal LP. Thereby, the control unit 50 sequentially transmits the data on the threshold voltage Vth of each of the drive transistors Tr3 of the qth column to the data driver 40. Further, in Fig. 21, in order to facilitate the explanation of the transition of the driving state, the number of repetitions of the latch pulse signal LP is indicated.

在時序t5,控制部50係對第q列之掃描線Ls 保持非選擇電壓VgL的施加,而且將傳輸開關SWtrs切換成關閉。又,控制部50將資料鎖存器43a之輸入端與資料暫存器電路42的暫存器連接。藉此,電壓輸出動作結束,對第q列之驅動電晶體Tr3的檢測動作結束。 At timing t5, the control unit 50 is paired with the scan line Ls of the qth column. The application of the non-selection voltage VgL is maintained, and the transfer switch SWtrs is switched to off. Further, the control unit 50 connects the input terminal of the material latch 43a to the register of the data register circuit 42. Thereby, the voltage output operation is completed, and the detection operation of the drive transistor Tr3 of the qth column is completed.

參照第22圖,說明係在從時序t2至時序t3之期間之資料線Ld的電位之資料線電位VLd的變遷。 Referring to Fig. 22, the transition of the data line potential VLd of the potential of the data line Ld during the period from the timing t2 to the timing t3 will be described.

如第22圖所示,係從時序t2所經過之時間的緩和時間t前進時,資料線電位VLd係隨著在該資料線Ld所連接之保持電容Cs之電荷的放電,從檢測用電壓VM接近寫入電壓WDVSS。然後,緩和時間t前進至飽和時間ts時,資料線電位VLd係在飽和電壓VLds飽和,而汲極電流變成不流動。在此時,將寫入電壓WDVSS與飽和電壓VLds之差設定為臨限值電壓Vth。此外,飽和時間ts例如是從3nsec至10nsec,從時序t2至時序t3之期間被設定成這種飽和時間ts以上。 As shown in Fig. 22, when the relaxation time t elapses from the time t2 elapses, the data line potential VLd is discharged from the detection voltage V with the charge of the storage capacitor Cs connected to the data line Ld. Near the write voltage WDVSS. Then, when the relaxation time t is advanced to the saturation time ts, the data line potential VLd is saturated at the saturation voltage VLds, and the drain current becomes non-flow. At this time, the difference between the write voltage WDVSS and the saturation voltage VLds is set as the threshold voltage Vth. Further, the saturation time ts is, for example, from 3 nsec to 10 nsec, and the period from the timing t2 to the timing t3 is set to be equal to or higher than the saturation time ts.

[檢測動作時序] [Detection action timing]

參照第23圖~第25圖,說明不發光期間所含之檢測動作的時序。此外,在以下,為了便於使用在像素Px之配置的列數與圖框數說明檢測動作的時序,舉例說明像素Px位於540列×960行,圖框速率係60fps的構成。第23圖表示第1圖框之在不發光期間之檢測動作的時序,第24圖表示第2圖框之在不發光期間之檢測動作的時序,第25圖表示第540圖框之在不發光期間之檢測動作的時序。此外,在像素Px之配置的列數亦可是540以外的列數。在像 素Px之配置的列數係m列時,第m圖框之檢測動作的時序相當於第25圖所示的內容。 Referring to Fig. 23 to Fig. 25, the timing of the detection operation included in the non-lighting period will be described. In the following, in order to facilitate the use of the number of columns and the number of frames arranged in the pixel Px, the timing of the detection operation will be described, and the configuration in which the pixel Px is located at 540 columns × 960 rows and the frame rate is 60 fps will be exemplified. Fig. 23 is a timing chart showing the detection operation of the first frame during the non-light-emitting period, Fig. 24 is a timing chart showing the detection operation of the second frame during the non-light-emitting period, and Fig. 25 is a view showing the 540th frame of the non-light-emitting period. The timing of the detection action during the period. Further, the number of columns arranged in the pixel Px may be the number of columns other than 540. In like When the number of columns in the arrangement of the prime Px is m columns, the timing of the detection operation of the mth frame corresponds to the content shown in FIG.

如第23圖所示,在時序Tf1a,在第1列之像素 Px發光用之寫入操作開始。發光用之寫入操作在第1列之像素Px結束時,發光操作在第1列之像素Px開始,而且發光用之寫入操作在第2列之像素Px開始。依此方式,從第1列之像素Px至第540列之像素Px,按照顯示用時脈週期,依序重複發光用之寫入操作,從發光用之寫入操作結束的列依序開始發光操作。 As shown in Fig. 23, at the timing Tf1a, the pixel in the first column The write operation for Px illumination begins. When the pixel for writing in the first column is completed, the light-emitting operation starts in the pixel Px in the first column, and the writing operation for light-emitting starts in the pixel Px in the second column. In this manner, from the pixel Px of the first column to the pixel Px of the 540th column, the writing operation for light emission is sequentially repeated in accordance with the clock cycle for display, and the light is sequentially emitted from the column in which the writing operation for light emission ends. operating.

在時序Tf1b,在第540列之像素Px進行發光用 之寫入操作,而且在第1列之像素Px不發光用之寫入操作開始。不發光用之寫入操作在第1列之像素Px結束時,不發光操作在第1列之像素Px開始,不發光用之寫入操作在第2列之像素Px開始。依此方式,從第1列之像素Px至第540列之像素Px,按照顯示用時脈週期,依序重複不發光用之寫入操作,從不發光用之寫入操作結束的列依序開始不發光操作。 At the timing Tf1b, the pixel Px of the 540th column is used for illumination. The write operation is started, and the write operation for the pixel Px in the first column is not illuminated. When the pixel operation Px in the first column is completed, the non-light-emitting operation starts in the pixel Px in the first column, and the non-light-emitting operation starts in the pixel Px in the second column. In this manner, from the pixel Px of the first column to the pixel Px of the 540th column, the writing operation for non-lighting is sequentially repeated in accordance with the clock cycle for display, and the column operation is completed from the end of the writing operation for non-lighting. Start not to illuminate.

在時序Tf1c,在第540列之像素Px進行不發光 操作,接著,從第1列之像素Px至第540列之像素Px,按照檢測用時脈週期,依序掃描選擇對象之候補。在此時,首先,將第1列之像素Px設定於被檢測出臨限值電壓Vth之檢測對象,進行對第1列之像素Px之檢測動作。然後,對於第1列之驅動電晶體Tr3的檢測資料Dout係被記憶於記憶部53。 At the timing Tf1c, the pixel Px at the 540th column is not illuminated. Then, from the pixel Px of the first column to the pixel Px of the 540th column, the candidates of the selection target are sequentially scanned in accordance with the clock cycle for detection. At this time, first, the pixel Px of the first column is set to the detection target to which the threshold voltage Vth is detected, and the detection operation of the pixel Px of the first column is performed. Then, the detection data Dout of the drive transistor Tr3 of the first column is stored in the memory unit 53.

在第1列之像素Px檢測動作結束時,從第2列 之像素Px至第540列之像素Px,按照檢測用時脈週期,依序掃描選擇對象之候補。在此掃描之期間,對全部之掃描線Ls施加非選擇電壓VgL,而全部像素Px保持不使EL元件11發光之狀態。 When the pixel Px detection operation in the first column ends, from the second column The pixel Px to the pixel Px of the 540th column sequentially scan the candidates of the selection target in accordance with the clock cycle for detection. During this scanning, the non-selection voltage VgL is applied to all of the scanning lines Ls, and all of the pixels Px are kept in a state where the EL elements 11 are not illuminated.

在時序Tf2a,至第540列之像素Px掃描選擇對 象之候補時,再度開始對第1列之像素Px之發光用的寫入操作。 In the timing Tf2a, to the pixel Px of the 540th column scan selection pair When the image is candidate, the writing operation for the light emission of the pixel Px of the first column is resumed.

如第24圖所示,在時序Tf2a,在第1列之像素Px發光用之寫入操作開始。發光用之寫入操作在第1列之像素Px結束時,發光操作在第1列之像素Px開始,而且發光用之寫入操作在第2列之像素Px開始。依此方式,從第1列之像素Px至第540列之像素Px,按照顯示用時脈週期,依序重複發光用之寫入操作,從發光用之寫入操作結束的列開始依序發光操作。 As shown in Fig. 24, at the timing Tf2a, the writing operation for light-emitting of the pixel Px in the first column is started. When the pixel for writing in the first column is completed, the light-emitting operation starts in the pixel Px in the first column, and the writing operation for light-emitting starts in the pixel Px in the second column. In this manner, from the pixel Px of the first column to the pixel Px of the 540th column, the writing operation for light emission is sequentially repeated in accordance with the clock cycle for display, and the light is sequentially emitted from the column in which the writing operation for light emission ends. operating.

在時序Tf2b,在第540列之像素Px進行發光用 之寫入操作,而且在第1列之像素Px不發光用之寫入操作開始。不發光用之寫入操作在第1列之像素Px結束時,不發光操作在第1列之像素Px開始,不發光用之寫入操作在第2列之像素Px開始。依此方式,從第1列之像素Px至第540列之像素Px,按照顯示用時脈週期,依序重複不發光用之寫入操作,從不發光用之寫入操作結束的列依序開始不發光操作。 At the timing Tf2b, the pixel Px of the 540th column is used for illumination. The write operation is started, and the write operation for the pixel Px in the first column is not illuminated. When the pixel operation Px in the first column is completed, the non-light-emitting operation starts in the pixel Px in the first column, and the non-light-emitting operation starts in the pixel Px in the second column. In this manner, from the pixel Px of the first column to the pixel Px of the 540th column, the writing operation for non-lighting is sequentially repeated in accordance with the clock cycle for display, and the column operation is completed from the end of the writing operation for non-lighting. Start not to illuminate.

在時序Tf2c,在第540列之像素Px進行不發光 操作,接著,從第1列之像素Px至第540列之像素Px,按照檢測用時脈週期,依序掃描選擇對象之候補。在此時 ,首先,將第2列之像素Px設定於被檢測出臨限值電壓Vth之檢測對象,按照檢測用時脈週期之選擇對象位元的位移進行至第2列之像素Px。在此,在選擇對象之候補係第1列之像素Px時,對掃描線Ls施加非選擇電壓VgL。然後,在選擇對象之候補係第2列之像素Px時,對第2列之像素Px進行檢測動作。 At the timing Tf2c, the pixel Px at the 540th column is not illuminated. Then, from the pixel Px of the first column to the pixel Px of the 540th column, the candidates of the selection target are sequentially scanned in accordance with the clock cycle for detection. currently First, the pixel Px of the second column is set to the detection target to which the threshold voltage Vth is detected, and the pixel Px of the second column is shifted in accordance with the displacement of the selection target bit of the detection clock cycle. Here, when the candidate pixel is selected as the pixel Px of the first column, the non-selection voltage VgL is applied to the scanning line Ls. Then, when the candidate pixel candidate selects the pixel Px of the second column, the pixel Px of the second column is detected.

藉此,關於第2列之驅動電晶體Tr3的檢測資 料Dout被記憶於控制部50之記憶部53。然後,對第2列之像素Px的檢測動作結束時,從第3列之像素Px至第540列之像素Px,按照檢測用時脈週期,依序掃描選擇對象之候補。在此掃描之期間,對全部之掃描線Ls施加非選擇電壓VgL,而全部像素Px保持不使EL元件11發光之狀態。 Thereby, the detection of the driving transistor Tr3 of the second column The material Dout is memorized in the memory unit 53 of the control unit 50. Then, when the detection operation of the pixel Px in the second column is completed, the candidate for the selection target is sequentially scanned from the pixel Px of the third column to the pixel Px of the 540th column in accordance with the detection clock cycle. During this scanning, the non-selection voltage VgL is applied to all of the scanning lines Ls, and all of the pixels Px are kept in a state where the EL elements 11 are not illuminated.

在時序Tf3a,至第540列之像素Px掃描選擇對象之候補時,再度開始對第1列之像素Px之發光用的寫入操作。 At the timing Tf3a, when the pixel Px of the 540th column scans the candidate of the selection target, the writing operation for the light emission of the pixel Px of the first column is resumed.

如第25圖所示,在時序Tfma,在第1列之像素Px發光用之寫入操作開始。發光用之寫入操作在第1列之像素Px結束時,發光操作在第1列之像素Px開始,而且發光用之寫入操作在第2列之像素Px開始。依此方式,從第1列之像素Px至第540列之像素Px,按照顯示用時脈週期,依序重複發光用之寫入操作,從發光用之寫入操作結束的列依序開始發光操作。 As shown in Fig. 25, at the timing Tfma, the writing operation for light-emitting of the pixel Px in the first column is started. When the pixel for writing in the first column is completed, the light-emitting operation starts in the pixel Px in the first column, and the writing operation for light-emitting starts in the pixel Px in the second column. In this manner, from the pixel Px of the first column to the pixel Px of the 540th column, the writing operation for light emission is sequentially repeated in accordance with the clock cycle for display, and the light is sequentially emitted from the column in which the writing operation for light emission ends. operating.

在時序Tfmb,在第540列之像素Px進行發光用之寫入操作,而且在第1列之像素Px不發光用之寫入操 作開始。不發光用之寫入操作在第1列之像素Px結束時,不發光操作在第1列之像素Px開始,不發光用之寫入操作在第2列之像素Px開始。依此方式,從第1列之像素Px至第540列之像素Px,按照顯示用時脈週期,依序重複不發光用之寫入操作,從不發光用之寫入操作所結束的列依序開始不發光操作。 At the timing Tfmb, the pixel Px in the 540th column performs a writing operation for light emission, and the pixel Px in the first column does not emit light for writing operation. Start. When the pixel operation Px in the first column is completed, the non-light-emitting operation starts in the pixel Px in the first column, and the non-light-emitting operation starts in the pixel Px in the second column. In this manner, from the pixel Px of the first column to the pixel Px of the 540th column, the writing operation for non-lighting is sequentially repeated in accordance with the clock cycle for display, and the column is terminated by the writing operation for non-lighting. The sequence starts without lighting operation.

在時序Tfmc,在第540列之像素Px進行不發 光操作,接著,從第1列之像素Px至第540列之像素Px,按照檢測用時脈週期,依序掃描選擇對象之候補。在此時,首先,將第540列之像素Px設定於被檢測出臨限值電壓Vth之檢測對象,按照檢測用時脈週期之選擇對象位元的位移進行至第539列之像素Px。在此,在選擇對象之候補係從第1列之像素Px至第539列之像素Px時,對掃描線Ls施加非選擇電壓VgL。然後,在選擇對象之候補係第540列之像素Px時,對第540列之像素Px進行檢測動作。 藉此,關於第540列之驅動電晶體Tr3的檢測資料Dout被記憶於控制部50之記憶部53。在時序Tfmd,對第540列之像素Px的檢測動作結束,而對第1列之像素Px,再度開始發光用之寫入操作。 At the timing Tfmc, the pixel Px in the 540th column is not sent. In the optical operation, the pixels of the first column Px to the pixels Px of the 540th column are sequentially scanned for the candidates of the selection target in accordance with the clock cycle for detection. At this time, first, the pixel Px of the 540th column is set to the detection target to which the threshold voltage Vth is detected, and the pixel Px of the 539th column is performed in accordance with the displacement of the selection target bit of the detection clock cycle. Here, when the candidate to be selected is from the pixel Px of the first column to the pixel Px of the 539th column, the non-selection voltage VgL is applied to the scanning line Ls. Then, when the pixel Px of the 540th column is selected as the candidate of the selection target, the detection operation is performed on the pixel Px of the 540th column. Thereby, the detection data Dout of the drive transistor Tr3 of the 540th column is stored in the memory unit 53 of the control unit 50. At the timing Tfmd, the detection operation of the pixel Px of the 540th column is completed, and the writing operation for the light emission is started again for the pixel Px of the first column.

依此方式,按每顯示一個圖框,至第540列之 像素Px,進行不發光操作,然後,對特定列的像素Px進行檢測動作。臨限值電壓Vth之檢測對象係從第1列之像素Px沿著掃描方向逐列依各圖框依序偏移。即,在第k圖框(k係1以上的整數),對第q列(1≦q≦539)之像素Px進行檢測動作時,在第k+1圖框中,對第q+1列之像素Px 進行檢測動作。檢測對象前進至最後列的像素Px時,檢測對象再回到第1列之像素Px。 In this way, each frame is displayed, to the 540th column. The pixel Px performs a non-light-emitting operation, and then performs a detection operation on the pixel Px of a specific column. The target value of the threshold voltage Vth is sequentially shifted from the pixel Px of the first column to the respective columns in the scanning direction. In other words, in the kth frame (k is an integer of 1 or more), when the pixel Px of the qth column (1≦q≦539) is detected, the q+1th column is in the k+1th frame. Pixel Px Perform the detection action. When the detection target advances to the pixel Px of the last column, the detection object returns to the pixel Px of the first column.

在此時,在檢測對象係第q列時所得之檢測資 料Dout係在控制部50的記憶部53中,被記憶於第q列之像素Px所被賦予對應的記憶區域而被更新。然後,控制部50係在第k+1圖框產生顯示資料Din時,使用最新之檢測資料Dout,作為第q列之檢測資料Dout。此外,控制部50係再使用在第k圖框所使用之檢測資料Dout,作為第q列以外之檢測資料Dout。藉此,各列之檢測資料Dout係每重複圖框之顯示540次就被更新。 At this time, the test capital obtained when the object is detected in the qth column The material Dout is stored in the memory unit 53 of the control unit 50, and is stored in the corresponding memory region of the pixel Px stored in the qth column, and is updated. Then, when the display data Din is generated in the k+1th frame, the control unit 50 uses the latest detection data Dout as the detection data Dout of the qth column. Further, the control unit 50 reuses the detection data Dout used in the kth frame as the detection data Dout other than the qth column. Thereby, the test data Dout of each column is updated 540 times per repeated frame display.

參照第26圖,詳細說明在顯示一個圖框的期 間之控制信號的變遷。又,在顯示一個圖框的期間之控制信號的變遷係對各檢測對象都相同,所以在以下,舉例說明在第k圖框之檢測對象係第q列之像素Px時之控制信號的變遷。 Refer to Figure 26 for a detailed description of the period in which a frame is displayed. The change of the control signal between the two. Further, since the transition of the control signal during the display of one frame is the same for each detection target, the transition of the control signal when the pixel Px of the qth column of the detection target in the kth frame is exemplified will be described below.

選擇驅動器20係因應於起動脈衝信號SP2之 輸入,按照顯示用時脈週期產生位移信號,在根據位移信號之時序,對各掃描線Ls依序施加選擇電壓VgH。在此時,選擇驅動器20係從第1列之掃描線Ls至第540列之掃描線Ls依序按照顯示用時脈週期,施加選擇電壓VgH。 The selection driver 20 is adapted to the start pulse signal SP2. The input generates a displacement signal in accordance with the clock period for display, and sequentially applies the selection voltage VgH to each of the scanning lines Ls according to the timing of the displacement signal. At this time, the selection driver 20 applies the selection voltage VgH in accordance with the display clock period from the scanning line Ls of the first column to the scanning line Ls of the 540th column.

電源驅動器30係因應於起動脈衝信號SP2之 輸入,按照顯示用時脈週期產生位移信號,在根據位移信號之時序,依序選擇供給對象之候補。在此時,電源驅動器30係從第1列之電源線La至第540列之電源線La依序,這亦按照顯示用時脈週期,施加寫入電壓WDVSS。 The power driver 30 is adapted to the start pulse signal SP2 The input generates a displacement signal according to the clock cycle for display, and selects candidates for the supply target in sequence according to the timing of the displacement signal. At this time, the power source driver 30 sequentially selects the power source line La from the first column to the 540th column, and applies the write voltage WDVSS in accordance with the display clock cycle.

然後,在對第q列(q係從1至540的整數)之掃 描線Ls施加選擇電壓VgH,而且對第q列之電源線La施加寫入電壓WDVSS時,根據顯示資料Din之發光電壓VD被施加於資料線Ld。又,從被施加選擇電壓VgH之列依序對掃描線Ls施加非選擇電壓VgL,而且從被施加寫入電壓WDVSS之列依序對電源線La施加驅動電壓ELVDD。然後,在對第q列之掃描線Ls施加非選擇電壓VgL,而且對第q列之電源線La施加驅動電壓ELVDD時,根據顯示資料Din之汲極電流被供給至EL元件11。 Then, in the q-th column (q is an integer from 1 to 540) When the selection voltage VgH is applied to the trace line Ls, and the write voltage WDVSS is applied to the power supply line La of the qth column, the light-emission voltage VD according to the display data Din is applied to the data line Ld. Moreover, the non-selection voltage VgL is sequentially applied to the scanning line Ls from the column to which the selection voltage VgH is applied, and the driving voltage ELVDD is sequentially applied to the power source line La from the column to which the writing voltage WDVSS is applied. Then, when the non-selection voltage VgL is applied to the scanning line Ls of the qth column, and the driving voltage ELVDD is applied to the power supply line La of the qth column, the drain current according to the display data Din is supplied to the EL element 11.

發光操作進行至第540列之像素Px時,選擇驅 動器20係因應於起動脈衝信號SP2之輸入,再使選擇電壓VgH之施加的掃描開始。又,驅動電壓ELVDD之施加進行至第540列之像素Px時,電源驅動器30係因應於起動脈衝信號SP2之輸入,再使寫入電壓WDVSS之施加的掃描開始。 When the illumination operation proceeds to the pixel Px of the 540th column, the selection drive The actuator 20 starts scanning of the application of the selection voltage VgH in response to the input of the start pulse signal SP2. When the application of the driving voltage ELVDD is performed to the pixel Px of the 540th column, the power driver 30 starts the scanning of the application of the write voltage WDVSS in response to the input of the start pulse signal SP2.

然後,在對第q列之掃描線Ls施加選擇電壓 VgH,而且對第q列之電源線La施加寫入電壓WDVSS時,根據顯示資料Din之不發光電壓VDN被施加於資料線Ld。藉此,驅動電晶體Tr3之成為逆向的閘極-源極間電壓Vgs被施加於驅動電晶體Tr3。 Then, applying a selection voltage to the scan line Ls of the qth column VgH, and when the write voltage WDVSS is applied to the power supply line La of the qth column, the non-light-emitting voltage VDN according to the display data Din is applied to the data line Ld. Thereby, the gate-source voltage Vgs which is reversed in the driving transistor Tr3 is applied to the driving transistor Tr3.

不發光操作進行至第540列之像素Px時,起動 脈衝信號SP2之輸入達到設定次數,在掃描線Ls之掃描所使用的位移時脈信號係從顯示用時脈週期切換成檢測用時脈週期。然後,選擇驅動器20係按照檢測用時脈週期,使選擇對象之候補位移,而電源驅動器30係按照檢測 用時脈週期,使供給對象之候補位移。在此期間,因為掩蔽脈衝信號MP係低位準,所以選擇驅動器20對選擇對象之候補不施加選擇電壓VgH。此外,在此期間,電源驅動器30對供給對象之候補持續施加寫入電壓WDVSS。 When the non-lighting operation proceeds to the pixel Px of the 540th column, the start is started. The input of the pulse signal SP2 reaches the set number of times, and the displacement clock signal used for scanning the scanning line Ls is switched from the display clock cycle to the detection clock cycle. Then, the selection driver 20 shifts the candidate of the selection target according to the clock cycle for detection, and the power driver 30 follows the detection. Use the clock cycle to shift the candidate of the supply object. During this period, since the masking pulse signal MP is at a low level, the selection driver 20 does not apply the selection voltage VgH to the candidate of the selection target. Further, during this period, the power source driver 30 continuously applies the write voltage WDVSS to the candidate of the supply target.

選擇對象之候補位移至第q列時,掩蔽脈衝信 號MP切換成高位準,選擇驅動器20對第q列之掃描線Ls施加選擇電壓VgH。然後,控制部50檢測出第q列之像素Px的臨限值電壓Vth。 Masking pulse letter when selecting the candidate displacement to the qth column The number MP is switched to the high level, and the selection driver 20 applies the selection voltage VgH to the scanning line Ls of the qth column. Then, the control unit 50 detects the threshold voltage Vth of the pixel Px of the qth column.

控制部50取得對第q列之像素Px的檢測資料 Dout時,掩蔽脈衝信號MP係再切換成低位準。然後,選擇驅動器20係按照檢測用時脈週期,使選擇對象之候補位移至第540列,電源驅動器30亦按照檢測用時脈週期,使供給對象之候補位移至第540列。在此期間,因為掩蔽脈衝信號MP係低位準,所以選擇驅動器20對選擇對象之候補不施加選擇電壓VgH。此外,在此期間,電源驅動器30對供給對象之候補持續施加寫入電壓WDVSS。 The control unit 50 acquires detection data for the pixel Px of the qth column. At Dout, the masking pulse signal MP is switched to a lower level. Then, the selection driver 20 shifts the candidate of the selection target to the 540th column in accordance with the detection clock cycle, and the power source driver 30 shifts the candidate of the supply target to the 540th column in accordance with the detection clock cycle. During this period, since the masking pulse signal MP is at a low level, the selection driver 20 does not apply the selection voltage VgH to the candidate of the selection target. Further, during this period, the power source driver 30 continuously applies the write voltage WDVSS to the candidate of the supply target.

選擇對象之候補位移至第540列時,掩蔽脈衝 信號MP再切換成高位準。然後,從第1列之掃描線Ls至第540列之掃描線Ls依序,再度開始發光用之寫入操作與發光操作。 Masking pulse when selecting the candidate displacement to the 540th column The signal MP is then switched to a high level. Then, from the scanning line Ls of the first column to the scanning line Ls of the 540th column, the writing operation and the light-emitting operation for light emission are started again.

若依據該第3實施形態,可得到以下所列舉的優點。 According to the third embodiment, the advantages listed below can be obtained.

(1)檢測出驅動電晶體Tr3之臨限值電壓Vth,並根據臨限值電壓Vth修正顯示資料Din。因此,抑制臨限值電壓Vth的變動所造成之畫質的劣化。 (1) The threshold voltage Vth of the driving transistor Tr3 is detected, and the display data Din is corrected based on the threshold voltage Vth. Therefore, the deterioration of the image quality caused by the fluctuation of the threshold voltage Vth is suppressed.

(2)因為在顯示一個圖框之期間進行檢測動 作,所以即使是臨限值電壓Vth之變動在短期間變大的情況,亦抑制所顯示之畫質的劣化。 (2) because the detection is performed during the display of a frame Therefore, even when the fluctuation of the threshold voltage Vth becomes large in a short period of time, the deterioration of the displayed image quality is suppressed.

(3)臨限值電壓Vth之檢測的對象係在一次之檢測動作,是一條掃描線Ls所連接之n個像素Px。因此,與在一次之檢測動作之臨限值電壓Vth的檢測係全部之像素Px的構成相比,一次之檢測動作所需的時間變短。結果,在一個不發光期間組入檢測動作時,抑制因不發光期間變長所引起之影像品質的降低。 (3) The detection target of the threshold voltage Vth is one detection operation, and is one pixel Px to which one scanning line Ls is connected. Therefore, the time required for one detection operation is shorter than the configuration of all the pixels Px of the detection voltage Vth of the detection operation at one time. As a result, when the detection operation is incorporated in one non-light-emitting period, the deterioration of the image quality due to the lengthening of the non-light-emitting period is suppressed.

(4)尤其,因為在為了使動態影像的顯示變得 鮮明所插入之不發光期間進行檢測動作,所以檢測動作對影像之顯示性能所產生的影響係有效地受到抑制。 (4) Especially, because in order to make the display of motion pictures become Since the detection operation is performed during the non-lighting period in which the sharp insertion is performed, the influence of the detection operation on the display performance of the image is effectively suppressed.

(5)選擇對象之候補的切換係與發光用之寫入操作、發光操作、不發光用之寫入操作及不發光操作一樣,在檢測動作所進行。因此,選擇驅動器20係亦作用為依每顯示一個圖框就改變檢測對象的構成。 (5) The switching of the candidate to be selected is performed in the detection operation in the same manner as the writing operation for lighting, the lighting operation, the writing operation for non-lighting, and the non-lighting operation. Therefore, the selection driver 20 also functions to change the configuration of the detection object every time one frame is displayed.

(6)在檢測動作,檢測對象之候補的切換週期 係比顯示用時脈週期更短之檢測用時脈週期。因此,例如和檢測對象之候補的切換週期係顯示用時脈週期的構成相比,檢測動作所需的時間變短。 (6) In the detection operation, the switching period of the candidate of the detection object It is a detection clock cycle that is shorter than the clock cycle. Therefore, for example, the switching period of the candidate to be detected is shorter than the configuration of the display clock cycle, and the time required for the detection operation is shortened.

(7)每顯示一個圖框,臨限值電壓Vth之檢測 對象係從第1列之像素Px沿著掃描方向,逐列偏移。因此,與臨限值電壓Vth之檢測對象沿著掃描方向被間歇性地設定的構成相比,根據臨限值電壓Vth之顯示資料Din的修正係在掃描方向極微細。 (7) Detection of threshold voltage Vth for each frame displayed The object is shifted column by column from the pixel Px of the first column in the scanning direction. Therefore, compared with the configuration in which the detection target voltage Vth is intermittently set in the scanning direction, the correction of the display data Din according to the threshold voltage Vth is extremely fine in the scanning direction.

[變形例] [Modification]

上述之實施形態係可如以下所示變更後實施。 The above embodiments can be implemented as described below.

[不發光電壓VDN] [No illuminating voltage VDN]

‧在控制部50被賦予對應之發光電壓VD與不發光電壓VDN的關係可如以下所示變更。 The relationship between the corresponding light-emission voltage VD and the non-light-emitting voltage VDN given to the control unit 50 can be changed as follows.

如第27圖之折線LC1所示,不發光電壓VDN所具有之位準亦可是彼此相異的2個位準。而且,在發光電壓VD係切換值Vp以上時,對於該發光電壓VD,彼此相異的2個位準中,高位準之不發光電壓VDN被賦予對應。即,在與比對應於切換值Vp之灰階值更低的灰階值對應之發光電壓VD,對於該發光電壓VD,彼此相異的2個位準中,高位準之不發光電壓VDN被賦予對應。即,在與比對應於切換值Vp的灰階值還低的對應於灰階值之發光電壓VD,彼此相異的2個位準中,與寫入電壓WDVSS之電位差大的不發光電壓VDN被賦予對應。又,在與對應於切換值Vp的灰階值以上的對應於灰階值之發光電壓VD,彼此相異的2個位準中,接近寫入電壓WDVSS之不發光電壓VDN被賦予對應。即使是這種發光電壓VD與不發光電壓VDN的對應關係,在切換值Vp之附近,發光電壓VD愈高時不發光電壓VDN愈低之狀態。 As shown by the broken line LC1 of Fig. 27, the level of the non-light-emitting voltage VDN may be two levels different from each other. Further, when the light-emission voltage VD is equal to or higher than the switching value Vp, among the two levels different from each other, the non-light-emitting voltage VDN of the high level is given. That is, in the light-emitting voltage VD corresponding to the gray-scale value lower than the gray-scale value corresponding to the switching value Vp, for the light-emitting voltage VD, among the two levels different from each other, the high-level non-light-emitting voltage VDN is Give the correspondence. That is, in the two levels different from each other in the light-emitting voltage VD corresponding to the gray-scale value lower than the gray-scale value corresponding to the switching value Vp, the non-light-emitting voltage VDN which is larger than the potential difference of the write voltage WDVSS Is given a correspondence. Further, among the two levels different from the gradation voltage VD corresponding to the gray scale value corresponding to the gray scale value corresponding to the switching value Vp, the non-light-emitting voltage VDN close to the write voltage WDVSS is given. Even in the correspondence relationship between the illuminating voltage VD and the non-emission voltage VDN, the higher the illuminating voltage VD is, the lower the illuminating voltage VDN is in the vicinity of the switching value Vp.

在此時,如第27圖之折線LC2所示,彼此相異的2個位準中,高位準之不發光電壓VDN亦可是與第2實施形態之第2不發光電壓VDN2相同的位準。即,在不發光電壓VDN所具有之位準是彼此相異的2個位準時,至少一方的位準係在不發光用之寫入操作,亦可是在驅動 電晶體Tr3之閘極-源極間成為逆向的位準。此外,不發光電壓VDN所具有之位準的全部,在不發光用之寫入操作,亦可是在驅動電晶體Tr3之閘極-源極間成為逆向的位準。 At this time, as shown by the broken line LC2 of Fig. 27, among the two levels different from each other, the high-level non-light-emitting voltage VDN may be the same level as the second non-light-emitting voltage VDN2 of the second embodiment. That is, when the level of the non-light-emitting voltage VDN is two levels different from each other, at least one of the levels is a writing operation for non-lighting, or may be driving. The gate-source between the transistors Tr3 becomes a reverse level. Further, all of the levels of the non-light-emitting voltage VDN may be reversed between the gate and the source of the driving transistor Tr3 in the writing operation for non-light-emitting.

此外,如第27圖之一點鏈線LC3所示,不發 光電壓VDN所具有之位準亦可是彼此相異的3個位準,亦可是彼此相異的4個位準。總之,作為發光電壓VD與不發光電壓VDN之對應關係,只要係包含發光電壓VD愈高時不發光電壓VDN愈低之狀態的構成即可。 In addition, as shown in the dot line LC3 of Figure 27, no The level of the photovoltage VDN may be three levels that are different from each other, or four levels that are different from each other. In short, the correspondence relationship between the light-emitting voltage VD and the non-light-emitting voltage VDN may be a configuration in which the higher the light-emitting voltage VD is, the lower the non-light-emitting voltage VDN is.

如第28圖之曲線LC4所示,在發光電壓VD之 全部的範圍,不發光電壓VDN亦可是連續地變化。即,在發光電壓VD之全部的範圍,亦可是發光電壓VD愈高時不發光電壓VDN愈低的對應關係。 As shown by the curve LC4 of Fig. 28, at the illuminating voltage VD For all ranges, the non-emissive voltage VDN may also vary continuously. In other words, in the range of the entire illuminating voltage VD, the higher the illuminating voltage VD is, the lower the non-illuminating voltage VDN is.

這時,如第28圖之一點鏈線LC5所示,對對 應於最高灰階值之發光電壓VD,亦可位準與第2實施形態之第2不發光電壓VDN2相同的不發光電壓VDN被賦予對應。 At this time, as shown by the dot chain line LC5 in Fig. 28, the pair is right. The non-light-emitting voltage VDN which is the same as the second non-light-emitting voltage VDN2 of the second embodiment may be assigned to the light-emitting voltage VD of the highest gray scale value.

此外,如第28圖之虛線LC6所示,亦可相對 發光電壓VD的變化之不發光電壓VDN的變化是依各發光電壓VD而異的構成。又,亦可包含相對發光電壓VD的變化,亦可不發光電壓VDN不變的對應關係。進而,如實線LC7所示,亦可以發光電壓VD低時之不發光電壓VDN(例如-5V)成為比發光電壓VD之最小值(例如-10V)更高的方式將發光電壓VD與不發光電壓VDN賦予對應。總之,作為發光電壓VD與不發光電壓VDN之對應關係 ,只要係包含發光電壓VD愈高時不發光電壓VDN愈低之狀態的構成即可。 In addition, as shown by the dotted line LC6 in Fig. 28, it is also possible to The change in the non-emission voltage VDN of the change in the emission voltage VD is different depending on the respective emission voltages VD. Further, it may include a change in the relative light-emission voltage VD or a change in the non-light-emitting voltage VDN. Further, as indicated by the solid line LC7, the non-light-emitting voltage VDN (for example, -5 V) when the light-emitting voltage VD is low may be such that the light-emitting voltage VD and the non-light-emitting voltage are higher than the minimum value of the light-emitting voltage VD (for example, -10 V). The VDN is assigned a correspondence. In short, as a correspondence between the illuminating voltage VD and the non-emissive voltage VDN The configuration may be such that the higher the illuminating voltage VD is, the lower the illuminating voltage VDN is.

‧亦可發光電壓VD與對該發光電壓VD被賦 予對應之不發光電壓VDN係在彼此相異的圖框被施加於資料線Ld。總之,具有發光電壓VD愈高時不發光電壓VDN愈低之狀態係最重要。該發光電壓VD高時是說,對不發光電壓VDN被施加於資料線Ld的圖框,亦可是既定次數前的圖框,亦可是既定次數份的圖框。 ‧Can also emit light voltage VD and be assigned to the light-emitting voltage VD The corresponding non-light-emitting voltage VDN is applied to the data line Ld in a frame different from each other. In short, the state in which the lower the illuminating voltage VD is, the lower the illuminating voltage VDN is, the most important. When the illuminating voltage VD is high, the frame to which the non-light-emitting voltage VDN is applied to the data line Ld may be a frame before a predetermined number of times, or may be a frame of a predetermined number of times.

例如,控制部50係記憶在複數次份之發光期 間之發光用灰階資料的平均值,並依複數次之各發光期間,更新發光用灰階資料的平均值。然後,控制部50係使用在複數次之發光期間的發光用灰階資料之平均值的最新值,在其緊接著之複數次的不發光期間,產生相同的不發光用灰階資料。即,不發光電壓VDN係在複數次的不發光期間使用相同的值,亦可在複數次的不發光期間更新。即使是這種構成,亦包含發光電壓VD愈高時不發光電壓VDN愈低之狀態。 For example, the control unit 50 memorizes the illumination period of the plurality of copies. The average value of the gray scale data is used for the illumination, and the average value of the gray scale data for illumination is updated according to the plurality of illumination periods. Then, the control unit 50 uses the latest value of the average value of the gray scale data for light emission during the plurality of light emission periods, and generates the same gray scale data for non-light emission during the subsequent non-light emission period. That is, the non-light-emitting voltage VDN is the same value used for a plurality of non-light-emitting periods, and may be updated during a plurality of non-light-emitting periods. Even in such a configuration, the state in which the illuminating voltage VD is lower when the illuminating voltage VD is higher is included.

[驅動電路PCC] [Drive Circuit PCC]

‧如第29圖所示,驅動電路PCC所具備之3個電晶體Tr1~Tr3係未限定為n型電晶體,亦可是p型電晶體。在此時,EL元件11之陽極與係基準電壓線之一例的電源線La電性連接,驅動電晶體Tr3之源極Ns與EL元件11之陰極電性連接,驅動電晶體Tr3之汲極Nd與接地電壓線Lb電性連接。即使是這種構成,亦可得到依據第1實施形態之(1)至(5)、第2實施形態之(1)、(2)及第3實施形態之(1) 至(7)的優點。 ‧ As shown in Fig. 29, the three transistors Tr1 to Tr3 included in the drive circuit PCC are not limited to n-type transistors, and may be p-type transistors. At this time, the anode of the EL element 11 is electrically connected to the power supply line La of one example of the reference voltage line, the source Ns of the driving transistor Tr3 is electrically connected to the cathode of the EL element 11, and the drain of the transistor Tr3 is Nd. It is electrically connected to the ground voltage line Lb. Even in such a configuration, (1) to (5) according to the first embodiment, (1), (2), and (1) of the third embodiment can be obtained. The advantage to (7).

‧驅動電晶體Tr3具有閘極、源極及汲極,只 要源極與汲極之任一方係連接端,源極與汲極中另一方係供電端即可。而且,驅動電路PCC包括具有基準電壓之基準電壓線、驅動電晶體Tr3、與接地電壓線Lb及連接端連接之EL元件11及連接閘極與源極之保持電容係最重要。在這種驅動電路PCC,亦可省略取樣電晶體Tr1及切換電晶體Tr2之至少一個。 ‧Drive transistor Tr3 has gate, source and drain, only To connect either the source and the drain, the other of the source and the drain is the power supply. Further, the drive circuit PCC includes a reference voltage line having a reference voltage, a drive transistor Tr3, an EL element 11 connected to the ground voltage line Lb and the connection terminal, and a storage capacitor for connecting the gate and the source. At least one of the sampling transistor Tr1 and the switching transistor Tr2 may be omitted in the driving circuit PCC.

例如,在EL顯示裝置,亦可省略取樣電晶體 Tr1及切換電晶體Tr2,將掃描線Ls與驅動電晶體Tr3之閘極電性連接,而且將資料線Ld與驅動電晶體Tr3之源極電性連接。總之,驅動電路PCC,進而EL顯示裝置係在發光期間,在保持電容Cs保持相當於發光電壓VD之電壓,使因應於發光電壓VD之電流經由驅動電晶體Tr3,流至EL元件11。而且,EL顯示裝置係在不發光期間,在保持電容Cs保持相當於不發光電壓VDN之電壓,將供電端之電壓設定成已通過驅動電晶體Tr3之電流不流至EL元件11,只要係具有發光電壓VD愈高時不發光電壓VDN愈低之狀態的構成即可。 For example, in an EL display device, the sampling transistor can also be omitted. The Tr1 and the switching transistor Tr2 electrically connect the scan line Ls to the gate of the driving transistor Tr3, and electrically connect the data line Ld to the source of the driving transistor Tr3. In short, the drive circuit PCC and the EL display device maintain a voltage corresponding to the light-emission voltage VD in the storage capacitor Cs during the light-emitting period, and cause a current corresponding to the light-emission voltage VD to flow to the EL element 11 via the drive transistor Tr3. Further, the EL display device maintains a voltage corresponding to the non-light-emitting voltage VDN while the storage capacitor Cs is not emitting light, and sets the voltage of the power supply terminal so that the current that has passed through the driving transistor Tr3 does not flow to the EL element 11, as long as it has The higher the illuminating voltage VD is, the lower the state in which the illuminating voltage VDN is not lowered.

[檢測動作] [Detection action]

‧亦可m列之掃描線被劃分成由彼此相鄰之10列的掃描線所構成之複數個掃描線群,各圖框之臨限值電壓Vth的檢測對象被設定成各掃描線群。 ‧ The scan lines of the m columns are divided into a plurality of scan line groups composed of 10 scan lines adjacent to each other, and the detection target of the threshold voltage Vth of each frame is set as each scan line group.

如第30圖所示,在第1圖框之檢測動作,從第1個掃描線群,第1列之像素Px被設定成檢測對象。在第2 圖框之檢測動作,從第2個掃描線群,第11列之像素Px被設定成檢測對象。依此方式,每顯示一個圖框,從第1列之像素Px至第531列之像素Px,每隔10列,檢測對象係位移。 As shown in Fig. 30, in the detection operation in the first frame, the pixel Px in the first column is set as the detection target from the first scanning line group. At the 2nd In the detection operation of the frame, the pixel Px in the eleventh column is set as the detection target from the second scanning line group. In this manner, the displacement of the target is detected every 10 columns from the pixel Px of the first column to the pixel Px of the 531st column for each frame displayed.

如第31圖所示,在第55圖框,從第1個掃描線 群,第2列之像素Px被設定成檢測對象。在第56圖框,從第2個掃描線群,第12列之像素Px被設定成檢測對象。依此方式,每顯示一個圖框,從第2列之像素Px至第532列之像素Px,每隔10列,檢測對象係位移。 As shown in Figure 31, in the 55th frame, from the 1st scan line The group P2 of the second column is set as the detection target. In the 56th frame, from the second scanning line group, the pixel Px of the 12th column is set as the detection target. In this manner, for every frame displayed, the target system displacement is detected every 10 columns from the pixel Px of the second column to the pixel Px of the 532th column.

如第32圖所示,在第487圖框,從第1個掃描 線群,第10列之像素Px被設定成檢測對象。在第488圖框之檢測動作,從第2個掃描線群,第20列之像素Px被設定成檢測對象。依此方式,每顯示一個圖框,從第10列之像素Px至第540列之像素Px,每隔10列,檢測對象係位移。藉此,各列之檢測資料Dout係每顯示圖框m次,就被更新一次。 As shown in Figure 32, in the 487th frame, from the first scan In the line group, the pixel Px of the 10th column is set as the detection target. In the detection operation of the 488th frame, the pixel Px of the 20th column is set as the detection target from the second scanning line group. In this manner, for every frame displayed, from the pixel Px of the tenth column to the pixel Px of the 540th column, the displacement of the object is detected every tenth column. Thereby, the test data Dout of each column is updated once every time the frame is displayed m times.

‧此外,亦可在m列之掃描線被劃分成由彼 此相鄰之10列的掃描線所構成之複數個掃描線群時,根據檢測資料Dout之顯示資料Din的修正係以如以下所示之形態實施。 ‧ In addition, the scan line in column m can also be divided into In the case of a plurality of scanning line groups composed of the scanning lines of the adjacent ten columns, the correction of the display data Din based on the detection data Dout is performed as follows.

即,在控制部50之記憶部53具備m/10列×n行 的記憶區域,將沿著行方向所排列之10個像素Px的每一者與一個記憶區域賦予對應。例如,記憶部53係將在第1個掃描線群之第1行的像素Px與第1列第1行的記憶區域賦予對應,將在第2個掃描線群之第2行的像素Px與第2 列第2行的記憶區域賦予對應。又,記憶部53係將在第54個掃描線群之第959行的像素Px與第54列第959行的記憶區域賦予對應,將在第54個掃描線群之第960行的像素Px與第54列第960行的記憶區域賦予對應。 That is, the memory unit 53 of the control unit 50 has m/10 columns × n rows. The memory area corresponds to each of the ten pixels Px arranged along the row direction. For example, the memory unit 53 associates the pixel Px in the first row of the first scanning line group with the memory region in the first row and the first row, and sets the pixel Px in the second row of the second scanning line group. 2nd The memory area of the second row of the column is assigned. Further, the memory unit 53 associates the pixel Px of the 959th line of the 54th scanning line group with the memory area of the 54th line and the 959th line, and sets the pixel Px of the 960th line of the 54th scanning line group with The memory area of the 54th line and the 960th line is assigned.

控制部50之影像信號處理部54係在產生顯示 資料Din時,從記憶部53讀出各像素Px之灰階資料、與該像素Px所被賦予對應的檢測資料Dout。而且,影像信號處理部54係對各像素Px之灰階資料,實施根據該像素Px所被賦予對應之檢測資料Dout的加減運算,產生各像素Px之顯示資料Din。 The video signal processing unit 54 of the control unit 50 generates a display. In the case of the data Din, the gray scale data of each pixel Px and the detection data Dout corresponding to the pixel Px are read from the memory unit 53. Further, the video signal processing unit 54 performs addition and subtraction of the corresponding detection data Dout given to the pixel Px for the gray scale data of each pixel Px, and generates display data Din for each pixel Px.

‧亦可在這次之顯示圖框的期間所得的檢測 資料Dout,在下次之顯示圖框的期間,當作全部之列的檢測資料Dout來處理。 ‧The test that can be obtained during the display of this frame The data Dout is processed as the detection data Dout of all the columns during the next display of the frame.

‧檢測對象亦可在各圖框被設定成同一列。 又,亦可檢測對象係在各圖框被設定成不規則。此外,在檢測對象依各圖框被設定成不規則的情況,例如,在控制部50使用在從1至m之間在各圖框產生亂數的隨機函數。而且,只要是根據檢測用位移時脈信號Clkr輸出位移等待部分的時序、與根據掩蔽脈衝信號MP輸出掩蔽解除部分的時序同步,而且這些時序從起動脈衝信號SP2僅延遲因應於所產生之亂數之時間的構成。 ‧The detection object can also be set to the same column in each frame. Further, the object to be detected may be set to be irregular in each frame. Further, in the case where the detection target is set to be irregular according to each frame, for example, the control unit 50 uses a random function that generates a random number in each frame from 1 to m. Further, as long as the timing of outputting the displacement waiting portion based on the detection displacement clock signal Clkr is synchronized with the timing of outputting the mask release portion based on the mask pulse signal MP, and these timings are delayed only from the start pulse signal SP2 in response to the generated random number The composition of time.

‧檢測對象亦可在各圖框被設定成2個以上。 在此時,在檢測用位移時脈信號Clkr,在彼此相異的時序輸出2個位移等待部分,在掩蔽脈衝信號MP,亦在彼此相異的時序輸出2個掩蔽解除部分。而且,輸出2個位 移等待部分之每一者的時序與輸出2個掩蔽解除部分之每一者的時序同步。 ‧ The detection target can be set to two or more in each frame. At this time, the displacement clock signal Clkr for detection outputs two displacement waiting portions at timings different from each other, and the masking pulse signal MP also outputs two mask releasing portions at timings different from each other. Moreover, output 2 bits The timing of each of the shift waiting sections is synchronized with the timing of outputting each of the two mask releasing sections.

‧例如,亦可在EL顯示裝置被起動時、EL顯 示裝置從暫停至復原時等,在顯示一個圖框的期間以外,對全部之列或一部分之列的各驅動電路PCC,進行檢測動作。 ‧ For example, when the EL display device is activated, EL display The display device performs a detection operation for each of the drive circuits PCC in all or a part of the columns except for the period from the time of the pause to the restoration.

‧亦可在一次之檢測動作所施加的檢測用電 壓VM是依各資料線Ld彼此相異的構成。在此時,在檢測動作,亦可複數條資料線Ld之每一者係經由彼此相異的配線與類比電源70連接。或者,亦可檢測用電壓VM係作為數位資料,從資料驅動器40被供給至資料線Ld。 ‧Can also use the test power applied in one detection action The pressure VM is configured to be different from each other according to each data line Ld. At this time, in the detection operation, each of the plurality of data lines Ld may be connected to the analog power source 70 via wirings different from each other. Alternatively, the detection voltage VM system may be used as the digital data, and supplied from the data driver 40 to the data line Ld.

‧亦可在一次之檢測動作被施加檢測用電壓 VM的資料線Ld是在全部之資料線Ld的一部分。在此時,在一次之檢測動作,僅成為檢測用電壓VM之施加對象之一部分的資料線Ld經由檢測用電壓開關SWs與類比電源70連接。 ‧The detection voltage can also be applied in one detection operation The data line Ld of the VM is a part of the entire data line Ld. At this time, in one detection operation, only the data line Ld which is one of the application targets of the detection voltage VM is connected to the analog power source 70 via the detection voltage switch SWs.

‧在上述之實施形態,作為驅動電晶體Tr3 之特性,檢測出臨限值電壓Vth,並根據所檢測出之臨限值電壓Vth,修正發光電壓VD。不限於此,亦可作為驅動電晶體Tr3之特性,檢測出電流放大率β,並根據所檢測出之電流放大率β,修正發光電壓VD。又,亦可作為驅動電晶體Tr3之特性,檢測出臨限值電壓Vth與電流放大率β之雙方。總之,只要在檢測動作之檢測對象係在驅動電晶體Tr3之元件特性中,對被供給至EL元件11之驅動電流有影響的參數即可。 ‧ In the above embodiment, as the driving transistor Tr3 The characteristic is that the threshold voltage Vth is detected, and the illuminating voltage VD is corrected based on the detected threshold voltage Vth. The present invention is not limited thereto, and the current amplification factor β may be detected as the characteristic of the driving transistor Tr3, and the illuminating voltage VD may be corrected based on the detected current amplification factor β. Further, as the characteristics of the driving transistor Tr3, both the threshold voltage Vth and the current amplification factor β can be detected. In short, the detection target to be detected is a parameter that affects the driving current supplied to the EL element 11 in the element characteristics of the driving transistor Tr3.

‧亦可在修正發光電壓VD時,除了驅動電晶 體Tr3之元件特性以外,還使用發光亮度等之EL元件11的發光特性。 ‧When the illuminating voltage VD is corrected, in addition to driving the crystallization In addition to the element characteristics of the body Tr3, the light-emitting characteristics of the EL element 11 such as the light-emitting luminance are also used.

‧發光元件亦可是有機EL元件,亦可是無機EL元件。 ‧ The light-emitting element may be an organic EL element or an inorganic EL element.

10‧‧‧顯示面板 10‧‧‧ display panel

11‧‧‧有機EL元件 11‧‧‧Organic EL components

30‧‧‧電源驅動器 30‧‧‧Power Driver

40‧‧‧資料驅動器 40‧‧‧Data Drive

41‧‧‧移位暫存器電路 41‧‧‧Shift register circuit

42‧‧‧資料暫存器電路 42‧‧‧data register circuit

43‧‧‧資料鎖存電路 43‧‧‧ Data Latch Circuit

43a‧‧‧資料鎖存器 43a‧‧‧ Data Latch

44‧‧‧電壓變換電路 44‧‧‧Voltage conversion circuit

44a‧‧‧顯示用DAC 44a‧‧‧Display DAC

45‧‧‧緩衝電路 45‧‧‧ buffer circuit

45a‧‧‧緩衝器 45a‧‧‧buffer

46a‧‧‧位準位移器 46a‧‧‧ Position Displacement

60‧‧‧邏輯電源 60‧‧‧Logical power supply

70‧‧‧類比電源 70‧‧‧ analog power supply

Ce‧‧‧像素電容 Ce‧‧‧pixel capacitor

Cp‧‧‧寄生電容 Cp‧‧‧ parasitic capacitance

Cs‧‧‧保持電容 Cs‧‧‧Resistance Capacitor

Din‧‧‧顯示資料 Din‧‧‧Display information

La‧‧‧電源線 La‧‧‧Power cord

Lb‧‧‧接地電壓線 Lb‧‧‧ grounding voltage line

Ld‧‧‧資料線 Ld‧‧‧ data line

LP‧‧‧鎖存脈衝信號 LP‧‧‧Latch pulse signal

Ls‧‧‧掃描線 Ls‧‧‧ scan line

PCC‧‧‧驅動電路 PCC‧‧‧ drive circuit

Px‧‧‧像素 Px‧‧ pixels

SP1‧‧‧起動脈衝信號 SP1‧‧‧ start pulse signal

Tr1‧‧‧取樣電晶體 Tr1‧‧‧Sampling transistor

Tr2‧‧‧切換電晶體 Tr2‧‧‧Switching transistor

Tr3‧‧‧驅動電晶體 Tr3‧‧‧ drive transistor

VD‧‧‧發光電壓 VD‧‧‧ luminous voltage

VDN‧‧‧不發光電壓 VDN‧‧‧ non-lighting voltage

VEE‧‧‧類比基準電壓 VEE‧‧‧ analog reference voltage

VgH‧‧‧選擇電壓 VgH‧‧‧Select voltage

VgL‧‧‧非選擇電壓 VgL‧‧‧ non-selective voltage

LVDD‧‧‧邏輯電源電壓 LVDD‧‧‧ logic supply voltage

LVSS‧‧‧邏輯基準電壓 LVSS‧‧‧Logical Reference Voltage

ELVDD‧‧‧驅動電壓 ELVDD‧‧‧ drive voltage

ELVSS‧‧‧基準電壓 ELVSS‧‧ ‧ reference voltage

WDVSS‧‧‧寫入電壓 WDVSS‧‧ ‧ write voltage

Claims (8)

一種EL顯示裝置,具備複數個像素電路;該像素電路係包括:驅動電晶體,係具有閘極、源極及汲極,該源極與該汲極之任一方係連接端,在該源極與該汲極中另一方係供電端;EL元件,係與該連接端電性連接;及保持電容,係與該閘極與該源極電性連接;該EL顯示裝置係以如下之方式所構成,在發光期間,在該保持電容保持相當於發光電壓之電壓,而使因應於該發光電壓之電流經由該驅動電晶體流至該EL元件;在不發光期間,在該保持電容保持相當於不發光電壓之電壓,並以已通過該驅動電晶體之電流不流至該EL元件的方式設定該供電端的電壓;具有該發光電壓愈高時該不發光電壓愈低之狀態。 An EL display device comprising a plurality of pixel circuits; the pixel circuit comprising: a driving transistor having a gate, a source and a drain, wherein the source and the drain are connected to each other at the source And the other side of the drain is a power supply end; the EL element is electrically connected to the connection end; and the holding capacitor is electrically connected to the gate and the source; the EL display device is in the following manner In the illuminating period, the holding capacitor maintains a voltage corresponding to the illuminating voltage, and a current corresponding to the illuminating voltage flows to the EL element via the driving transistor; during the non-lighting period, the holding capacitor remains equivalent The voltage of the voltage is not emitted, and the voltage of the power supply terminal is set such that the current that has passed through the driving transistor does not flow to the EL element; and the higher the light-emitting voltage is, the lower the non-light-emitting voltage is. 如請求項1之EL顯示裝置,其中以重複由該發光期間與該不發光期間所構成之圖框的方式所構成;具有該發光電壓愈高時該不發光電壓愈低之狀態。 An EL display device according to claim 1, wherein the frame formed by the light-emitting period and the non-light-emitting period is repeated; and the higher the light-emitting voltage is, the lower the non-light-emitting voltage is. 如請求項1或2之EL顯示裝置,其中該不發光電壓係將在該發光電壓之設定範圍中的中間值作為基準,並與該發光電壓對稱的反轉電壓。 An EL display device according to claim 1 or 2, wherein the non-light-emitting voltage is an inverted value which is a reference value in a set range of the light-emitting voltage and which is symmetrical with the light-emitting voltage. 如請求項1至3中任一項之EL顯示裝置,其中該像素電路係以如下之方式所構成,在該發光期間之該發光電壓與切換值相同或比其低時,將極性與該發光電壓相同,而且該發光電壓愈高時被設定成愈低的電壓作為該不發光電壓,由該保持電容保持;在該發光期間之該發光電壓比該切換值高時,將極性與該發光電壓係相異的電壓作為該不發光電壓,由該保持電容保持。 The EL display device according to any one of claims 1 to 3, wherein the pixel circuit is configured in such a manner that the polarity and the luminescence are the same when the illuminating voltage during the illuminating period is the same as or lower than the switching value The voltage is the same, and the higher the illuminating voltage is, the lower the voltage is set as the non-emissive voltage, which is held by the holding capacitor; when the illuminating voltage is higher than the switching value during the illuminating period, the polarity and the illuminating voltage are A different voltage is used as the non-emissive voltage and is held by the holding capacitor. 如請求項4之EL顯示裝置,其中該像素電路係以在該發光期間之該發光電壓比切換值高時,將該不發光電壓設為定值的方式所構成。 The EL display device according to claim 4, wherein the pixel circuit is configured to set the non-light-emitting voltage to a constant value when the light-emitting voltage during the light-emitting period is higher than a switching value. 如請求項1至5中任一項之EL顯示裝置,其中以如下之方式所構成,在該不發光期間,包含檢測出該驅動電晶體之臨限值電壓的檢測動作;在該發光期間,使用上次之檢測動作的檢測結果,預先修正該發光電壓。 The EL display device according to any one of claims 1 to 5, wherein the non-light-emitting period includes a detection operation for detecting a threshold voltage of the driving transistor; during the light-emitting period, The light-emitting voltage is corrected in advance using the detection result of the last detection operation. 一種EL顯示裝置之驅動方法,係具備複數個像素電路之EL顯示裝置的驅動方法,該像素電路係包括:驅動電晶體,係具有閘極、源極及汲極,該源極與該汲極之任一方係連接端,在該源極與該汲極中另一方係供電端;EL元件,係與該連接端電性連接;及 保持電容,係與該閘極與該源極電性連接;該EL顯示裝置之驅動方法係包括:發光步驟,係在該保持電容保持相當於發光電壓之電壓,而使因應於該發光電壓之電流經由該驅動電晶體流至該EL元件;及不發光步驟,係在該保持電容保持相當於以具有該發光電壓愈高時愈低之狀態的方式所設定之不發光電壓的電壓,並以已通過該驅動電晶體之電流不流至該EL元件的方式設定該供電端的電壓。 A driving method of an EL display device is a driving method of an EL display device having a plurality of pixel circuits, the pixel circuit comprising: a driving transistor having a gate, a source, and a drain, the source and the drain Either the connection end, the other end of the source and the drain is a power supply end; the EL element is electrically connected to the connection end; The holding capacitor is electrically connected to the gate and the source; the driving method of the EL display device includes: a light emitting step of maintaining a voltage corresponding to the light emitting voltage at the holding capacitor, so as to be dependent on the light emitting voltage a current flowing through the driving transistor to the EL element; and a non-light emitting step, wherein the holding capacitor maintains a voltage corresponding to a non-light-emitting voltage set to a state lower than a state in which the light-emitting voltage is higher, and The voltage at the power supply terminal has been set in such a manner that the current of the drive transistor does not flow to the EL element. 如請求項7之EL顯示裝置之驅動方法,其中該不發光步驟再包含檢測出該驅動電晶體之臨限值電壓的檢測步驟;在該發光步驟,使用上次之該檢測步驟的檢測結果,預先修正該發光電壓。 The driving method of the EL display device of claim 7, wherein the non-lighting step further comprises a detecting step of detecting a threshold voltage of the driving transistor; and in the illuminating step, using the detection result of the last detecting step, The illuminating voltage is corrected in advance.
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