TW201500730A - Laser measurement device and calibration mechanism - Google Patents

Laser measurement device and calibration mechanism Download PDF

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Publication number
TW201500730A
TW201500730A TW102122505A TW102122505A TW201500730A TW 201500730 A TW201500730 A TW 201500730A TW 102122505 A TW102122505 A TW 102122505A TW 102122505 A TW102122505 A TW 102122505A TW 201500730 A TW201500730 A TW 201500730A
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Taiwan
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laser probe
calibration
fixing
hole
laser
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TW102122505A
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Chinese (zh)
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TWI593954B (en
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Kuei-Yang Lin
Ming-Shan Cao
Fan-Jian Zeng
Bin Chen
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Hon Hai Prec Ind Co Ltd
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Publication of TWI593954B publication Critical patent/TWI593954B/en

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Abstract

A calibration mechanism is disposed on a fixed assembly, a first laser sensor and a second sensor are separately disposed to the fixed assembly. The calibration facilities includes a mounting plate, an adjust part and a column, the mounting plate is disposed to the fixed assembly. The adjust part includes an adjust section, a fixed section and a calibration block, the adjust section is movably disposed on the mounting plate, the column is receive in the fixed section, the calibration block is disposed at one side of the fixed section, the adjust part slides on the mounting plate, so that the first laser sensor and the second laser sensor are aligned with the column or the calibration block.

Description

激光測量裝置及其校準機構Laser measuring device and calibration mechanism thereof

本發明涉及一種校準機構,尤其涉及一種應用於激光測量過程之校準機構。The invention relates to a calibration mechanism, in particular to a calibration mechanism applied to a laser measurement process.

激光測量係一種非接觸式測量,其因具有不影響被測產品之表面、精度高、測量範圍大、檢測時間短等優點而得到廣泛的應用。在使用激光測試產品前,需要對激光之位置進行校準,以保證激光測試結果之準確性。然而習知之激光位置校準機構大都需要手工操作,難以實現自動化。Laser measurement is a kind of non-contact measurement, which has been widely used because it has the advantages of not affecting the surface of the product to be tested, high precision, large measurement range, and short detection time. Before using the laser test product, the position of the laser needs to be calibrated to ensure the accuracy of the laser test results. However, most of the conventional laser position calibration mechanisms require manual operation and it is difficult to automate.

有鑑於此,有必要提供一種便於自動校正激光位置之校準機構。In view of this, it is necessary to provide a calibration mechanism that facilitates automatic correction of the laser position.

另,有必要提供一種應用上述校準機構之激光測量裝置。In addition, it is necessary to provide a laser measuring device to which the above calibration mechanism is applied.

一種校準機構,其安裝在固定組件上,該固定組件上相對間隔安裝第一激光測頭及第二激光測頭。該校準機構包括安裝板、調節件及柱體,該安裝板安裝於固定組件上。該調節件包括一體設置之調節段、固定段及校準塊,該調節段活動地安裝在該安裝板上,該柱體容置於該固定段內,該校準塊凸設在該固定段一側,該調節件在該安裝板上滑動,使得該第一激光測頭及該第二激光測頭對該准柱體或該校準塊。A calibration mechanism is mounted on a stationary component that mounts a first laser probe and a second laser probe at relatively spaced intervals. The calibration mechanism includes a mounting plate, an adjustment member and a cylinder, and the mounting plate is mounted on the fixing assembly. The adjusting member comprises an integrally arranged adjusting section, a fixing section and a calibration block, the adjusting section is movably mounted on the mounting plate, the column body is received in the fixing section, and the calibration block is protruded on the side of the fixing section The adjusting member slides on the mounting plate such that the first laser probe and the second laser probe face the quasi cylinder or the calibration block.

一種激光測量裝置,其包括固定組件、第一激光測頭及第二激光測頭,該第一激光測頭及該第二激光測頭相間隔地安裝在該固定組件上。該校準機構包括安裝板、調節件及柱體;該安裝板安裝於該固定組件上。該調節件包括一體設置之調節段、固定段及校準塊,該調節段活動地安裝在該安裝板上,該柱體容置於該固定段內,該校準塊凸設在該固定段一側,該調節件在該安裝板上滑動,使得該第一激光測頭及該第二激光測頭對準該柱體或該校準塊。A laser measuring device includes a fixing assembly, a first laser probe and a second laser probe, and the first laser probe and the second laser probe are mounted on the fixing assembly at intervals. The calibration mechanism includes a mounting plate, an adjustment member and a cylinder; the mounting plate is mounted on the fixing assembly. The adjusting member comprises an integrally arranged adjusting section, a fixing section and a calibration block, the adjusting section is movably mounted on the mounting plate, the column body is received in the fixing section, and the calibration block is protruded on the side of the fixing section The adjusting member slides on the mounting plate such that the first laser probe and the second laser probe are aligned with the cylinder or the calibration block.

本發明之校準機構結構簡單,該調節件在該安裝板上之相對位置可調,且該第一激光測頭及該第二激光測頭僅需掃描該柱體及該校準塊即可實現對第一激光測頭及第二激光測頭之位置校準,校準過程自動化,校位準確。The calibration mechanism of the present invention has a simple structure, the relative position of the adjusting member on the mounting plate is adjustable, and the first laser probe and the second laser probe only need to scan the cylinder and the calibration block to achieve The position calibration of the first laser probe and the second laser probe, the calibration process is automated, and the calibration position is accurate.

100‧‧‧校準機構100‧‧‧calibration agency

10‧‧‧安裝板10‧‧‧Installation board

20‧‧‧調節件20‧‧‧Adjustment

30‧‧‧柱體30‧‧‧Cylinder

40‧‧‧擋片40‧‧ ‧Flap

11‧‧‧基板11‧‧‧Substrate

12‧‧‧連接板12‧‧‧Connecting board

111‧‧‧安裝孔111‧‧‧Mounting holes

121‧‧‧連接孔121‧‧‧connection hole

21‧‧‧調節段21‧‧‧ adjustment section

22‧‧‧固定段22‧‧‧Fixed section

23‧‧‧頂面23‧‧‧ top surface

24‧‧‧底面24‧‧‧ bottom

25‧‧‧校準塊25‧‧‧ calibration block

211‧‧‧滑槽211‧‧ ‧ chute

212‧‧‧通孔212‧‧‧through hole

221‧‧‧定位孔221‧‧‧Positioning holes

222‧‧‧收容槽222‧‧‧ housing trough

251‧‧‧第一校準段251‧‧‧First calibration segment

252‧‧‧第二校準段252‧‧‧Second calibration segment

41‧‧‧固定孔41‧‧‧Fixed holes

200‧‧‧固定組件200‧‧‧Fixed components

210‧‧‧固定板210‧‧‧Fixed plate

2101‧‧‧安裝槽2101‧‧‧Installation slot

2012‧‧‧固定孔2012‧‧‧Fixed holes

220‧‧‧支撐板220‧‧‧support board

230‧‧‧連接件230‧‧‧Connecting parts

240‧‧‧第一承載板240‧‧‧First carrier board

250‧‧‧第二承載板250‧‧‧Second carrier board

圖1係本發明較佳實施方式具有校準機構激光測量裝置之工作狀態示意圖。1 is a schematic view showing the working state of a laser measuring device having a calibration mechanism according to a preferred embodiment of the present invention.

圖2係圖1所示之校準機構的分解示意圖。2 is an exploded perspective view of the calibration mechanism shown in FIG. 1.

圖3係圖2所示之調節件的放大示意圖。Figure 3 is an enlarged schematic view of the adjusting member shown in Figure 2.

圖4係圖1所示之激光測量裝置部分組裝示意圖。4 is a partial assembly diagram of the laser measuring device shown in FIG. 1.

請參閱圖1,一種激光測量裝置包括一校準機構100、固定組件200、第一激光測頭(圖未示)及第二激光測頭(圖未示)。該校準機構100安裝在該固定組件200上,該第一激光測頭及該第二激光測頭相間隔地安裝在該固定組件200上。Referring to FIG. 1, a laser measuring device includes a calibration mechanism 100, a fixing assembly 200, a first laser probe (not shown), and a second laser probe (not shown). The calibration mechanism 100 is mounted on the fixing assembly 200, and the first laser probe and the second laser probe are mounted on the fixing assembly 200 at intervals.

請參閱圖2,該校準機構100包括安裝板10、調節件20、柱體30及擋片40。該調節件20可活動之安裝在該安裝板10上,該柱體30容置於該調節件20內,該擋片40蓋合在該柱體30上。Referring to FIG. 2 , the calibration mechanism 100 includes a mounting plate 10 , an adjustment member 20 , a cylinder 30 , and a blocking piece 40 . The adjusting member 20 is movably mounted on the mounting plate 10, and the cylindrical body 30 is received in the adjusting member 20, and the blocking member 40 is attached to the cylindrical body 30.

該安裝板10包括基板11及垂直固定在該基板11一端的連接板12。該基板11一端開設安裝孔111。該連接板12大致呈L型,該連接板12遠離該安裝孔111之一端開設二連接孔121。The mounting board 10 includes a substrate 11 and a connecting board 12 vertically fixed to one end of the substrate 11. One end of the substrate 11 defines a mounting hole 111. The connecting plate 12 is substantially L-shaped, and the connecting plate 12 defines two connecting holes 121 away from one end of the mounting hole 111.

請結合參閱圖3,該調節件20大致為矩形板體,其具有相對設置之頂面23及底面24。該調節件20進一步包括一體設置的調節段21、固定段22及校準塊25。該調節段21上開設貫穿頂面23及底面24之滑槽211,該滑槽211兩側分別開設通孔212,該通孔212臨近該固定段22設置。該固定段22上開設定位孔221,本實施例中,該定位孔221為一方形孔,其由四周壁依次圍接而成。該定位孔221相對之二周壁均凹陷形成一收容槽222,該收容槽222與該定位孔221連通。該校準塊25設置於該固定段22一側,並臨近該定位孔221,該校準塊25大致呈凸字型,其包括呈階梯形平行設置之第一校準段251及第二校準段252。該第二校準段252與該頂面23之落差小於該第二校準段252與該底面24之落差。本實施例中,定義該第二校準段252與頂面23之落差為距離一H1,該第二校準段252與該第一校準段251之落差為距離二H2,該第二校準段252與底面24之落差為距離三H3。Referring to FIG. 3 , the adjusting member 20 is substantially a rectangular plate body having oppositely disposed top surfaces 23 and bottom surfaces 24 . The adjustment member 20 further includes an adjustment section 21, a fixed section 22 and a calibration block 25 which are integrally provided. The adjusting section 21 defines a sliding slot 211 extending through the top surface 23 and the bottom surface 24 . A through hole 212 is defined in each of the two sides of the sliding slot 211 . The through hole 212 is disposed adjacent to the fixing section 22 . A positioning hole 221 is defined in the fixing portion 22. In this embodiment, the positioning hole 221 is a square hole which is sequentially surrounded by surrounding walls. The positioning hole 221 is recessed with respect to the two peripheral walls to form a receiving groove 222. The receiving groove 222 is in communication with the positioning hole 221 . The calibration block 25 is disposed on one side of the fixed section 22 and adjacent to the positioning hole 221. The calibration block 25 is substantially in a convex shape, and includes a first calibration section 251 and a second calibration section 252 which are arranged in parallel in a step shape. The difference between the second calibration segment 252 and the top surface 23 is smaller than the difference between the second calibration segment 252 and the bottom surface 24. In this embodiment, the difference between the second calibration segment 252 and the top surface 23 is defined as a distance H1, and the difference between the second calibration segment 252 and the first calibration segment 251 is a distance two H2, and the second calibration segment 252 is The drop of the bottom surface 24 is the distance three H3.

請再參閱圖2,該柱體30為圓形,其兩端收容在該收容槽222內。本實施方式中,該擋片40之數量為二,每一擋片40一端開設固定孔41,該固定孔41與該通孔212相對應。Referring to FIG. 2 again, the column 30 is circular, and both ends of the column 30 are received in the receiving groove 222. In the embodiment, the number of the blocking pieces 40 is two, and one end of each of the blocking pieces 40 defines a fixing hole 41 corresponding to the through hole 212.

請參閱圖4,該固定組件200包括固定板210、支撐板220、連接件230、第一承載板240及第二承載板250。Referring to FIG. 4 , the fixing assembly 200 includes a fixing plate 210 , a supporting plate 220 , a connecting member 230 , a first carrying plate 240 , and a second carrying plate 250 .

該固定板210之一側凹設一安裝槽2101,該安裝槽2101之側壁上開設二螺孔2102。該螺孔2102與該連接孔121相對應,以便一固定件(如螺絲)穿過該連接孔121及該螺孔2102,進而將該安裝板10鎖固在該固定板210上。One mounting groove 2101 is recessed on one side of the fixing plate 210, and two screw holes 2102 are defined in the side wall of the mounting groove 2101. The screw hole 2102 corresponds to the connecting hole 121, so that a fixing member (such as a screw) passes through the connecting hole 121 and the screw hole 2102, thereby locking the mounting plate 10 on the fixing plate 210.

本實施方式中,該支撐板220之數量為二,該二支撐板220互相平行設置於該支撐板220的兩端。每一支撐板220及固定板210之間均通過一連接件230連接,以加強該固定板210及該支撐板220之連接強度。該第一承載板240固定於一支撐板220相對固定板210之一端,該第二承載板250固定於另一支撐板220相對固定板210之一端,並與第一承載板240相對設置。該第一承載板240上安裝第一激光測頭,該第二承載板250上安裝第二激光測頭,該第一激光測頭及該第二激光測頭均與一電腦電性連接,該電腦上安裝分析軟體。該第一激光測頭及該第二激光測頭可發射激光,並可將測試資訊傳送至該分析軟體。In this embodiment, the number of the support plates 220 is two, and the two support plates 220 are disposed in parallel with each other at both ends of the support plate 220. Each of the support plates 220 and the fixing plate 210 is connected by a connecting member 230 to strengthen the connection strength between the fixing plate 210 and the supporting plate 220. The first carrier plate 240 is fixed to one end of the support plate 220 opposite to the fixed plate 210. The second carrier plate 250 is fixed to one end of the other support plate 220 opposite to the fixed plate 210 and disposed opposite to the first carrier plate 240. A first laser probe is mounted on the first carrier plate 240, and a second laser probe is mounted on the second carrier 250. The first laser probe and the second laser probe are electrically connected to a computer. Install the analysis software on your computer. The first laser probe and the second laser probe can emit laser light and can transmit test information to the analysis software.

請結合參閱圖2及圖4,組裝該校準機構100時,一固定件(如螺絲)穿過該連接孔121及該螺孔2102,進而將該安裝板10鎖固在該固定板210上之安裝槽2101內。該柱體30容置於該收容槽222內。利用一鎖固件(如螺絲)穿過該固定孔41及該通孔212以將該擋片40鎖固於該調節件20上,該擋片40蓋合在該柱體30上以阻止該柱體30滑出收容槽222。該調節件20沿與該基板11平行之方向移動,當該固定段22位於該第一承載板240及該第二承載板250之間時,利用一鎖固件(如螺絲)穿過該滑槽211及該安裝孔111將該調節件20鎖固在該安裝板10上。Referring to FIG. 2 and FIG. 4 , when the calibration mechanism 100 is assembled, a fixing member (such as a screw) passes through the connecting hole 121 and the screw hole 2102 , thereby locking the mounting plate 10 on the fixing plate 210 . Installed in the slot 2101. The cylinder 30 is received in the receiving groove 222. A locking piece (such as a screw) is passed through the fixing hole 41 and the through hole 212 to lock the blocking piece 40 to the adjusting member 20, and the blocking piece 40 is covered on the column 30 to block the column. The body 30 slides out of the receiving groove 222. The adjusting member 20 moves in a direction parallel to the substrate 11. When the fixing portion 22 is located between the first carrier plate 240 and the second carrier plate 250, the locking member (such as a screw) passes through the sliding slot. The fixing member 20 is locked to the mounting plate 10 by the 211 and the mounting hole 111.

下面進一步說明該校準機構100之校準過程。該調節件20在該安裝板10上滑動,使得該柱體30位於該第一激光測頭及該第二激光測頭之間,該第一激光測頭及第二激光測頭發射激光至該柱體30位於該定位孔221內之部分,該第一激光測頭及第二激光測頭掃描出之該柱體30沿其直徑方向之輪廓圖形均為半圓弧,若二半圓弧共同圍接形成一封閉之圓形,則表明第一激光測頭及第二激光測頭位於同一直線上;若二半圓弧發生錯位,不能圍接形成一封閉圓形,則通過分析軟體進行偏差補償調節。另一方面,該調節件20在該安裝板10上滑動,使得該校準塊25位於該第一激光測頭及該第二激光測頭之間,該第一激光測頭及第二激光測頭發射激光至該校準塊25上,第一激光測頭及第二激光測頭掃描出之圖形均為階梯形,分析軟體測試得出各個臺階之間之高度,若各個測試高度與H1、H2及H3之實際高度值相一致,則表明第一激光測頭和第二激光測頭位於同一直線上;若各個測試高度與H1、H2和H3之實際高度值不一致,則通過分析軟體進行偏差補償調節,直至確認第一激光測頭及第二激光測頭位於同一直線後方可進行產品測試。The calibration process of the calibration mechanism 100 is further described below. The adjusting member 20 slides on the mounting plate 10 such that the post 30 is located between the first laser probe and the second laser probe, and the first laser probe and the second laser probe emit laser light to the The portion of the cylinder 30 is located in the positioning hole 221, and the contour pattern of the cylinder 30 along the diameter direction of the first laser probe and the second laser probe is a semi-circular arc, if the two semi-circular arcs are common When the enclosure forms a closed circle, it indicates that the first laser probe and the second laser probe are on the same straight line; if the two semi-circular arcs are misaligned and cannot be enclosed to form a closed circle, the deviation is analyzed by the software. Compensation adjustment. On the other hand, the adjusting member 20 slides on the mounting plate 10 such that the calibration block 25 is located between the first laser probe and the second laser probe, and the first laser probe and the second laser probe The laser is emitted onto the calibration block 25, and the patterns scanned by the first laser probe and the second laser probe are stepped, and the height of each step is analyzed by the software test, if each test height is H1 and H2 and The actual height values of H3 are consistent, indicating that the first laser probe and the second laser probe are on the same line; if the respective test heights are inconsistent with the actual height values of H1, H2 and H3, the deviation compensation adjustment is performed by analyzing the software. The product test can be performed until it is confirmed that the first laser probe and the second laser probe are in the same straight line.

本發明的校準機構100,通過滑槽211可調節該調節件20在該安裝板10上之相對位置,且第一激光測頭及第二激光測頭僅需掃描柱體30及校準塊25即可實現對第一激光測頭及第二激光測頭之校準,該校準機構100結構簡單,校準過程自動化,校位準確。The calibration mechanism 100 of the present invention can adjust the relative position of the adjusting member 20 on the mounting plate 10 through the sliding slot 211, and the first laser probe and the second laser probe only need to scan the cylinder 30 and the calibration block 25 The calibration of the first laser probe and the second laser probe can be realized. The calibration mechanism 100 has a simple structure, the calibration process is automated, and the calibration position is accurate.

no

100‧‧‧校準機構 100‧‧‧calibration agency

10‧‧‧裝板 10‧‧‧Installation

20‧‧‧調節件 20‧‧‧Adjustment

30‧‧‧柱體 30‧‧‧Cylinder

40‧‧‧擋片 40‧‧ ‧Flap

121‧‧‧連接孔 121‧‧‧connection hole

200‧‧‧固定組件 200‧‧‧Fixed components

210‧‧‧固定板 210‧‧‧Fixed plate

220‧‧‧支撐板 220‧‧‧support board

230‧‧‧連接件 230‧‧‧Connecting parts

240‧‧‧第一承載板 240‧‧‧First carrier board

250‧‧‧第二承載板 250‧‧‧Second carrier board

Claims (10)

一種校準機構,其安裝在固定組件上,該固定組件上相對間隔安裝第一激光測頭和第二激光測頭,其改良在於:該校準機構包括安裝板、調節件及柱體;該安裝板安裝於該固定組件上,該調節件包括一體設置之調節段、固定段及校準塊,該調節段活動地安裝在該安裝板上,該柱體容置於該固定段內,該校準塊凸設在該固定段一側,該調節件在該安裝板上滑動,使得該第一激光測頭及該第二激光測頭對準該柱體或該校準塊。A calibration mechanism mounted on a fixed component, the first laser probe and the second laser probe being mounted at a relatively spaced interval, wherein the calibration mechanism comprises: a mounting plate, an adjusting member and a cylinder; the mounting plate Mounted on the fixing component, the adjusting component comprises an integrally arranged adjusting section, a fixing section and a calibration block, the adjusting section is movably mounted on the mounting plate, the column body is received in the fixing section, and the calibration block is convex The adjusting member is slid on the mounting plate such that the first laser probe and the second laser probe are aligned with the cylinder or the calibration block. 如申請專利範圍1項所述之校準機構,其中所述安裝板包括基板及連接板,該基板一端開設安裝孔,該連接板垂直固定在該基板一端,該連接板遠離該安裝孔之一端,該調節段上開設滑槽,該滑槽和基板之安裝孔相對,該調節件鎖固在該安裝板上。The calibration mechanism of claim 1, wherein the mounting board comprises a substrate and a connecting plate, and a mounting hole is formed at one end of the substrate, the connecting plate is vertically fixed at one end of the substrate, and the connecting plate is away from one end of the mounting hole, A sliding slot is formed on the adjusting section, and the sliding slot is opposite to the mounting hole of the substrate, and the adjusting member is locked on the mounting board. 如申請專利範圍2項所述之校準機構,其中所述固定段上開設定位孔,該定位孔為一方形孔,其由四周壁依次圍接而成,其中相對設置之二周壁均凹陷形成一收容槽,該柱體兩端容置在該收容槽內。The calibration mechanism of claim 2, wherein the fixing section defines a positioning hole, wherein the positioning hole is a square hole, which is surrounded by the surrounding walls, wherein the opposite circumferential walls are recessed to form a The receiving slot is accommodated in the receiving slot at both ends of the cylinder. 如申請專利範圍3項所述之校準機構,其中所述滑槽兩側分別開設通孔,該校準機構還包括二擋片,每一擋片上開設固定孔,該固定孔與該通孔相對應,以通過一鎖固件穿過該固定孔及該通孔將該擋片鎖固在該調節件上,該二擋片蓋合於該柱體之兩端。The calibration mechanism of claim 3, wherein the two sides of the sliding slot are respectively provided with a through hole, the calibration mechanism further includes a second blocking piece, and each of the blocking pieces has a fixing hole, and the fixing hole corresponds to the through hole. The baffle is locked to the adjusting member through a fixing hole and the through hole, and the two blocking pieces are covered at both ends of the column. 如申請專利範圍4項所述之校準機構,其中所述校準塊呈凸字型,其包括呈階梯形設置之第一校準段及第二校準段。The calibration mechanism of claim 4, wherein the calibration block has a convex shape, and includes a first calibration segment and a second calibration segment disposed in a stepped shape. 如申請專利範圍5項所述之校準機構,其中所述調節件包括相對設置的頂面及底面,該第二校準段與該頂面之落差小於該第二校準段與該底面之落差。The calibration mechanism of claim 5, wherein the adjusting member comprises a top surface and a bottom surface disposed opposite to each other, and a difference between the second calibration portion and the top surface is smaller than a difference between the second calibration portion and the bottom surface. 如申請專利範圍2項所述之校準機構,其中所述固定組件包括固定板,該固定板一側凹設安裝槽,該安裝板裝配於該安裝槽內。The calibration mechanism of claim 2, wherein the fixing component comprises a fixing plate, and a fixing groove is recessed on one side of the fixing plate, and the mounting plate is fitted in the mounting groove. 一種激光測量裝置,其包括固定組件、第一激光測頭及第二激光測頭,該第一激光測頭及該第二激光測頭相間隔地安裝在該固定組件上,其改良在於:該激光測量裝置還包括一校準機構,該校準機構包括安裝板、調節件及柱體;該安裝板安裝於該固定組件上,該調節件包括一體設置的調節段、固定段及校準塊,該調節段活動地安裝在該安裝板上,該柱體容置於該固定段內,該校準塊凸設在該固定段一側,該調節件在該安裝板上滑動,使得該第一激光測頭及該第二激光測頭對準該柱體或該校準塊。A laser measuring device comprising a fixing component, a first laser probe and a second laser probe, wherein the first laser probe and the second laser probe are mounted on the fixing component at intervals, and the improvement is: The laser measuring device further includes a calibration mechanism including a mounting plate, an adjusting member and a cylinder; the mounting plate is mounted on the fixing component, the adjusting member comprises an integrally arranged adjusting section, a fixing section and a calibration block, the adjusting The step is movably mounted on the mounting plate, the column is received in the fixing section, the calibration block is protruded on one side of the fixing section, and the adjusting member slides on the mounting plate, so that the first laser probe And the second laser probe is aligned with the cylinder or the calibration block. 如申請專利範圍第8項所述之激光測量裝置,其中所述第一激光測頭及第二激光測頭用於掃描該柱體以分別獲取一半圓弧的圖形,若二半圓弧共同圍接形成一封閉之圓形,則表明第一激光測頭及第二激光測頭位於同一直線上,若二半圓弧發生錯位,不能圍接形成一封閉圓形,則通過分析軟體進行偏差補償以校正該第一激光測頭及該第二激光測頭之位置。The laser measuring device of claim 8, wherein the first laser probe and the second laser probe are used to scan the cylinder to obtain a half arc pattern, respectively. Forming a closed circle indicates that the first laser probe and the second laser probe are on the same straight line. If the two semi-circular arcs are misaligned and cannot be enclosed to form a closed circle, the deviation compensation is performed by analyzing the software. To correct the position of the first laser probe and the second laser probe. 如申請專利範圍第8項所述之激光測量裝置,其中所述第一激光測頭及第二激光測頭用於掃描該校準塊,以分別獲取呈階梯形的圖形,若各個臺階的測試高度與實際高度值相一致,則表明該第一激光測頭及該第二激光測頭位於同一直線,若測試高度與實際高度不一致,則通過分析軟體進行偏差補償以校正該第一激光測頭及該第二激光測頭之位置。The laser measuring device of claim 8, wherein the first laser probe and the second laser probe are used to scan the calibration block to respectively obtain a stepped pattern, if the test height of each step Consistent with the actual height value, it indicates that the first laser probe and the second laser probe are on the same straight line. If the test height is inconsistent with the actual height, the deviation compensation is performed by the analysis software to correct the first laser probe and The position of the second laser probe.
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