TW201445010A - Substrate plating device - Google Patents

Substrate plating device Download PDF

Info

Publication number
TW201445010A
TW201445010A TW103114014A TW103114014A TW201445010A TW 201445010 A TW201445010 A TW 201445010A TW 103114014 A TW103114014 A TW 103114014A TW 103114014 A TW103114014 A TW 103114014A TW 201445010 A TW201445010 A TW 201445010A
Authority
TW
Taiwan
Prior art keywords
plating
substrate
flow
cross
flow impeller
Prior art date
Application number
TW103114014A
Other languages
Chinese (zh)
Inventor
Junichiro Yoshioka
Takashi Murayama
Original Assignee
Jcu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jcu Corp filed Critical Jcu Corp
Publication of TW201445010A publication Critical patent/TW201445010A/en

Links

Classifications

    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F04POSITIVE - DISPLACEMENT MACHINES FOR LIQUIDS; PUMPS FOR LIQUIDS OR ELASTIC FLUIDS
    • F04DNON-POSITIVE-DISPLACEMENT PUMPS
    • F04D5/00Pumps with circumferential or transverse flow
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D21/00Processes for servicing or operating cells for electrolytic coating
    • C25D21/10Agitating of electrolytes; Moving of racks

Abstract

The purpose of the present invention is to provide a plating device, whereby it becomes possible to make the flow rate to become uniform in an area located between the bottom of a plating bath and a solution level without the need of providing a circulating pump at the outside of the plating bath, and therefore it becomes possible to form a plating film having a uniform thickness over the entire area of a substrate. A plating device equipped with: a plating bath in which a plating solution is to be placed; a substrate holder which can hold a substrate in such a manner that the substrate can be detached freely; an anode which is arranged so as to face the substrate that is held by the substrate holder; a cross-flow impeller which is arranged rotatablly and in a suspended state on the upstream side of the flow of the plating solution as observed from the substrate side; and a driving means for the cross-flow impeller.

Description

基板鍍敷裝置 Substrate plating device

本發明係關於在鍍敷液中浸漬基板且在基板表面進行鍍敷的鍍敷裝置。 The present invention relates to a plating apparatus which immerses a substrate in a plating solution and performs plating on the surface of the substrate.

以往,在垂直設置保持有基板的鍍敷治具,使鍍敷液由鍍敷槽的底面流入且由上面溢流的半導體基板用鍍敷裝置中,已知一種設有可在鍍敷治具與陽極之間往返的攪拌槳(paddle),俾以在鍍敷處理中將鍍敷液均一供給至基板的被鍍敷面的全部區域者。 Conventionally, in a plating apparatus for a semiconductor substrate in which a plating fixture for holding a substrate is vertically provided and a plating solution is poured from a bottom surface of a plating tank and overflows from the surface, it is known that a plating fixture can be provided. A paddle that reciprocates from the anode, and the plating solution is uniformly supplied to all areas of the plated surface of the substrate during the plating process.

若為藉由該攪拌槳所為之攪拌,係以鍍敷治具保持基板,一面使攪拌槳往返移動一面進行鍍敷處理,但是液流的方向與攪拌槳的行進方向為相反,會有由於液流方向成為交替而無法加速在表面的流速的課題。 In the case where the stirring blade is used for the stirring, the substrate is held by the plating jig, and the stirring blade is reciprocated while the plating process is performed. However, the direction of the liquid flow is opposite to the traveling direction of the stirring blade, and there is a liquid. The flow direction is a problem that alternates and cannot accelerate the flow velocity on the surface.

因此,在專利文獻1中係揭示一種藉由使鍍敷液發生渦流的渦發生器,使由鍍敷槽的下部被供給的鍍敷液發生渦流的鍍敷裝置。 For this reason, Patent Document 1 discloses a plating apparatus that vortexes a plating solution supplied from a lower portion of a plating tank by a vortex generator that vortexes a plating solution.

但是,若為該鍍敷裝置,必須在鍍敷槽外設置用以將鍍敷液送至渦發生器的循環泵,除了設置空間變 大以外,亦由於鍍敷液由鍍敷槽的下部被供給至渦發生器,因此難以在被鍍敷面的上下使流速成為均一。 However, in the case of the plating apparatus, it is necessary to provide a circulation pump for sending the plating liquid to the vortex generator outside the plating tank, except for the space change. In addition, since the plating liquid is supplied to the vortex generator from the lower portion of the plating tank, it is difficult to make the flow velocity uniform in the upper and lower sides of the surface to be plated.

[專利文獻1]日本特開2004-345066 [Patent Document 1] Japanese Patent Laid-Open No. 2004-345066

因此,本發明之課題在提供一種克服習知之鍍敷裝置的上述缺點,無須在鍍敷槽外設置循環泵,即可使流速由鍍敷槽的底部至液面為相同,可遍及基板全部區域,使鍍敷膜厚成為均一的鍍敷裝置。 SUMMARY OF THE INVENTION Accordingly, it is an object of the present invention to provide an overcoming of the above-mentioned disadvantages of the conventional plating apparatus, which can provide a flow rate from the bottom of the plating tank to the liquid surface without having to provide a circulation pump outside the plating tank, and can extend over the entire area of the substrate. The plating film thickness is made uniform.

本發明係解決上述課題者,為一種鍍敷裝置,其係具備有:收容鍍敷液的鍍敷槽;安裝卸下自如地保持基板的基板保持具;與被保持在該基板保持具的基板相對向配置的陽極;由基板觀看,旋轉自如地被垂設在鍍敷液流之上游側的交叉流葉輪;及該交叉流葉輪的驅動手段。 The present invention is directed to a plating apparatus including: a plating tank for accommodating a plating solution; a substrate holder for detachably holding the substrate; and a substrate held by the substrate holder a relatively disposed anode; a cross-flow impeller that is rotatably suspended on the upstream side of the plating liquid flow as viewed from the substrate; and a driving means of the cross-flow impeller.

本發明之鍍敷裝置係藉由被垂設在鍍敷槽內的交叉流葉輪,使鍍敷液作循環,因此可使流速由鍍敷槽的底部至液面為相同,可遍及基板全部區域,使鍍敷膜厚 成為均一。 The plating apparatus of the present invention circulates the plating solution by the cross-flow impeller which is suspended in the plating tank, so that the flow rate can be the same from the bottom of the plating tank to the liquid surface, and can be spread over the entire area of the substrate. To make the plating film thick Be uniform.

此外,本發明之鍍敷裝置並不需要在鍍敷槽外設置循環泵,因此亦可使設置空間較為小型化(compact)。 Further, since the plating apparatus of the present invention does not require a circulation pump to be provided outside the plating tank, the installation space can be made compact.

1‧‧‧鍍敷槽 1‧‧‧ plating tank

2‧‧‧基板保持具 2‧‧‧Substrate holder

3‧‧‧陽極 3‧‧‧Anode

4‧‧‧交叉流葉輪 4‧‧‧ Cross flow impeller

5‧‧‧干擾板 5‧‧‧Interference board

6‧‧‧干擾板 6‧‧‧Interference board

7‧‧‧整流板 7‧‧‧Rectifier board

41‧‧‧翼部 41‧‧‧ wing

42‧‧‧支持部 42‧‧‧Support Department

43‧‧‧軸部 43‧‧‧Axis

W‧‧‧基板 W‧‧‧Substrate

圖1係本發明之鍍敷裝置的概略平面圖。 BRIEF DESCRIPTION OF THE DRAWINGS Figure 1 is a schematic plan view of a plating apparatus of the present invention.

圖2(a)係本發明之鍍敷裝置的交叉流葉輪的正面圖,(b)係本發明之鍍敷裝置的交叉流葉輪的剖面圖。 Fig. 2 (a) is a front view of a cross flow impeller of a plating apparatus of the present invention, and (b) is a cross-sectional view of a cross flow impeller of the plating apparatus of the present invention.

圖3係本發明之鍍敷裝置中不同的實施態樣的概略平面圖。 Figure 3 is a schematic plan view of a different embodiment of the plating apparatus of the present invention.

圖4係本發明之鍍敷裝置中不同的實施態樣的概略平面圖。 Figure 4 is a schematic plan view of a different embodiment of the plating apparatus of the present invention.

以下根據圖示,具體說明本發明之鍍敷裝置的實施態樣。其中,本發明並非受到該等實施態樣任何限制。 Hereinafter, an embodiment of the plating apparatus of the present invention will be specifically described based on the drawings. However, the invention is not limited in any way by these embodiments.

圖1係本發明之鍍敷裝置的概略平面圖。如圖所示,本發明之鍍敷裝置係由以下構成:收容鍍敷液的鍍敷槽1;安裝卸下自如地保持基板的基板保持具2;與被保持在基板保持具2的基板W相對向配置的陽極3;由基板觀看,旋轉自如地被垂設在鍍敷液流之上游側的交叉 流葉輪4;交叉流葉輪4的驅動手段(未圖示);及設在交叉流葉輪4的近傍的干擾板5、6。以下說明各構件。 BRIEF DESCRIPTION OF THE DRAWINGS Figure 1 is a schematic plan view of a plating apparatus of the present invention. As shown in the figure, the plating apparatus of the present invention comprises a plating tank 1 for accommodating a plating liquid, a substrate holder 2 for detachably holding a substrate, and a substrate W held by the substrate holder 2. The oppositely disposed anode 3; viewed from the substrate, rotatably suspended on the upstream side of the plating liquid flow The flow impeller 4; the driving means (not shown) of the cross flow impeller 4; and the interference plates 5, 6 provided in the vicinity of the cross flow impeller 4. Each member will be described below.

圖2(a)係本發明之鍍敷裝置的交叉流葉輪4的正面圖。如圖所示,本實施態樣之交叉流葉輪4係在上下的圓板狀支持部42之間,隔著旋轉軸部分而以放射狀垂設有複數個翼部41。接著,由上部的支持部42係垂立有軸部43,將該軸部43作為旋轉軸而旋轉自如地設有翼部41。此外,在該軸部43的上部係連設有作為交叉流葉輪4之旋轉驅動手段的馬達。其中,在本實施態樣中,如圖2(b)所示,翼部41係形成為剖面矩形狀,但是形狀並非侷限於此,例如圖1所示,亦可將翼部41形成為在葉輪的旋轉行進方向具有凹面的弧狀。藉由設置該凹面,翼部41可更加效率佳地捕集鍍敷液而使流速提高。其中,關於翼部41的個數,並未特別限制。此外,關於翼部41的寬幅(圖面上為上下方向的長度),較佳為至少具有可含蓋基板W的被鍍敷面的高度的寬幅。 Fig. 2 (a) is a front elevational view of the cross flow impeller 4 of the plating apparatus of the present invention. As shown in the figure, the cross flow impeller 4 of the present embodiment is provided between the upper and lower disc-shaped support portions 42 so as to have a plurality of wing portions 41 radially extending therebetween via the rotating shaft portion. Next, the shaft portion 43 is erected by the upper support portion 42 , and the wing portion 41 is rotatably provided as the rotation shaft. Further, a motor as a rotational driving means of the cross flow impeller 4 is connected to the upper portion of the shaft portion 43. In the present embodiment, as shown in FIG. 2(b), the wing portion 41 is formed in a rectangular cross section, but the shape is not limited thereto. For example, as shown in FIG. 1, the wing portion 41 may be formed to be The direction of rotation of the impeller has a concave arc shape. By providing the concave surface, the wing portion 41 can more efficiently collect the plating liquid to increase the flow rate. Among them, the number of the wings 41 is not particularly limited. Further, it is preferable that the width of the wing portion 41 (the length in the vertical direction on the drawing) is at least the width of the height of the plated surface on which the lid substrate W can be covered.

如圖1所示,在鍍敷槽1內,交叉流葉輪4的前後方向的位置關係係以位於基板W與陽極3之間且其旋轉軸位於接近基板保持具2的方式進行配置,橫向的位置關係係以交叉流葉輪4的旋轉軸位於由基板W觀看為鍍敷液流的上游側且在比基板保持具2的端部更為外側的方式進行配置。 As shown in FIG. 1, in the plating tank 1, the positional relationship of the cross-flow impeller 4 in the front-rear direction is disposed so as to be located between the substrate W and the anode 3 and the rotation axis thereof is located close to the substrate holder 2, and is laterally The positional relationship is such that the rotation axis of the cross flow impeller 4 is located on the upstream side of the plating liquid flow viewed from the substrate W and is located outside the end portion of the substrate holder 2 .

在交叉流葉輪4的兩側垂設有將交叉流葉輪4夾在其間而形成鍍敷液的流路的一組干擾板5、6。具體 而言,干擾板5係具有:由陽極3側朝基板W側延伸的平面部;及由該平面部分的前端朝基板W方向彎曲的曲面部。接著,干擾板6係在比交叉流葉輪4更接近鍍敷槽1的壁面,以沿著交叉流葉輪4的外緣的方式彎曲垂設。藉由該等干擾板5、6,由鍍敷槽1內的陽極3側回流的鍍敷液被交叉流葉輪4所加速而發生箭號方向的液流。如上所示,在圖1的鍍敷裝置中,可藉由交叉流葉輪4而使鍍敷液的流速在被鍍敷面的上下成為均一。 On the both sides of the cross flow impeller 4, a pair of interference plates 5, 6 which sandwich the cross flow impeller 4 to form a flow path of the plating liquid are placed. specific The interference plate 5 has a flat portion extending from the anode 3 side toward the substrate W side, and a curved surface portion curved from the front end of the flat portion toward the substrate W. Next, the interference plate 6 is closer to the wall surface of the plating tank 1 than the cross flow impeller 4, and is bent so as to be along the outer edge of the cross flow impeller 4. The plating liquid which is reflowed from the anode 3 side in the plating tank 1 by the interference plates 5 and 6 is accelerated by the cross flow impeller 4, and a liquid flow in the direction of the arrow is generated. As described above, in the plating apparatus of Fig. 1, the flow velocity of the plating liquid can be made uniform by the cross-flow impeller 4 on the upper and lower sides of the surface to be plated.

圖3係本發明之鍍敷裝置中不同的實施態樣者。如圖所示,在本實施態樣中,在陽極3與鍍敷槽1的壁面之間設置空間,形成有鍍敷液的流路。藉此,如箭號所示,鍍敷槽1內的鍍敷液的回流變得更為流暢,故較為理想。 Figure 3 is a representation of various embodiments of the plating apparatus of the present invention. As shown in the figure, in the present embodiment, a space is provided between the anode 3 and the wall surface of the plating tank 1, and a flow path of the plating liquid is formed. Therefore, as indicated by the arrow, the reflow of the plating solution in the plating tank 1 becomes smoother, which is preferable.

圖4係本發明之鍍敷裝置中不同的實施態樣者。如圖所示,在本實施態樣中,在基板保持具2與陽極3之間隔著間隔垂設有複數整流板7。該整流板7係以由干擾板5的前端與基板保持具2並行的方式被設置為大致基板保持具2的全部寬幅。藉由該整流板7,基板W的被鍍敷面附近的液流變得更為均一,故較為理想。 Figure 4 is a different embodiment of the plating apparatus of the present invention. As shown in the figure, in the present embodiment, a plurality of rectifying plates 7 are provided at intervals between the substrate holder 2 and the anode 3. The rectifying plate 7 is provided so as to be substantially the entire width of the substrate holder 2 so that the tip end of the interference plate 5 is parallel to the substrate holder 2. The rectifying plate 7 is preferable since the liquid flow in the vicinity of the plated surface of the substrate W is more uniform.

其中,在以上各實施態樣中均為交叉流葉輪4係設置一個部位在由基板觀看為鍍敷液流的上游側,但是亦可另外在鍍敷液流的下游側追加形成為二個部位。例如,在上述各實施態樣中,係僅設在基板保持具2及陽極3的左側,但是亦可與此以成為左右對稱的方式,亦設在 基板保持具2及陽極3的右側。此時,仍然以成為左右對稱的方式在下游側亦追加干擾板5、6,將下游側的交叉流葉輪4的旋轉方向形成為與上游側為相同,藉此相對於基板,在鍍敷液流的上游與下游形成流動,因此可更加有效地促進鍍敷槽1內的順時計旋轉的回流。 In each of the above embodiments, the cross-flow impeller 4 is provided with one portion on the upstream side of the plating liquid flow viewed from the substrate, but may be additionally formed as two portions on the downstream side of the plating liquid flow. . For example, in each of the above embodiments, it is provided only on the left side of the substrate holder 2 and the anode 3, but it may be provided in a bilaterally symmetrical manner. The substrate holder 2 and the right side of the anode 3 are provided. At this time, the interference plates 5 and 6 are added to the downstream side so that the left and right sides are symmetrical, and the rotation direction of the downstream cross flow impeller 4 is formed to be the same as the upstream side, whereby the plating liquid is applied to the substrate. The flow is formed upstream and downstream of the flow, so that the backflow of the clockwise rotation in the plating tank 1 can be more effectively promoted.

1‧‧‧鍍敷槽 1‧‧‧ plating tank

2‧‧‧基板保持具 2‧‧‧Substrate holder

3‧‧‧陽極 3‧‧‧Anode

4‧‧‧交叉流葉輪 4‧‧‧ Cross flow impeller

5‧‧‧干擾板 5‧‧‧Interference board

6‧‧‧干擾板 6‧‧‧Interference board

41‧‧‧翼部 41‧‧‧ wing

W‧‧‧基板 W‧‧‧Substrate

Claims (6)

一種鍍敷裝置,其係具備有:收容鍍敷液的鍍敷槽;安裝卸下自如地保持基板的基板保持具;與被保持在該基板保持具的基板相對向配置的陽極;由基板觀看,旋轉自如地被垂設在鍍敷液流之上游側的交叉流葉輪;及該交叉流葉輪的驅動手段。 A plating apparatus comprising: a plating tank for accommodating a plating solution; a substrate holder that detachably holds the substrate; and an anode disposed to face the substrate held by the substrate holder; and viewed from the substrate a cross-flow impeller that is rotatably suspended on the upstream side of the plating liquid flow; and a driving means for the cross-flow impeller. 如申請專利範圍第1項之鍍敷裝置,其中,具備有將前述交叉流葉輪夾在其間而形成鍍敷液的流路的一組干擾板。 A plating apparatus according to claim 1, wherein the plating apparatus includes a pair of interference plates in which a flow path of the plating liquid is formed by sandwiching the cross flow impeller therebetween. 如申請專利範圍第1項或第2項之鍍敷裝置,其中,前述交叉流葉輪的翼部在葉輪的旋轉行進方向具有凹面。 A plating apparatus according to claim 1 or 2, wherein the wing portion of the cross flow impeller has a concave surface in a rotational traveling direction of the impeller. 如申請專利範圍第1項至第3項中任一項之鍍敷裝置,其中,藉由在前述陽極與前述鍍敷槽的壁面之間設置空間,來形成鍍敷液的流路。 The plating apparatus according to any one of claims 1 to 3, wherein a flow path of the plating solution is formed by providing a space between the anode and a wall surface of the plating tank. 如申請專利範圍第1項至第4項中任一項之鍍敷裝置,其中,在前述基板保持具與前述陽極之間隔著間隔垂設有複數整流板。 The plating apparatus according to any one of claims 1 to 4, wherein a plurality of rectifying plates are provided at a distance between the substrate holder and the anode. 如申請專利範圍第1項至第5項中任一項之鍍敷裝置,其中,由基板觀看,在鍍敷液流的下游側另外設有交叉流葉輪。 The plating apparatus according to any one of the items 1 to 5, wherein the cross-flow impeller is additionally provided on the downstream side of the plating liquid flow as viewed from the substrate.
TW103114014A 2013-05-13 2014-04-17 Substrate plating device TW201445010A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2013101339 2013-05-13

Publications (1)

Publication Number Publication Date
TW201445010A true TW201445010A (en) 2014-12-01

Family

ID=51898144

Family Applications (1)

Application Number Title Priority Date Filing Date
TW103114014A TW201445010A (en) 2013-05-13 2014-04-17 Substrate plating device

Country Status (2)

Country Link
TW (1) TW201445010A (en)
WO (1) WO2014185160A1 (en)

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0577266U (en) * 1992-03-23 1993-10-22 川崎製鉄株式会社 Metal plate fluid plating equipment
JPH0741997A (en) * 1993-07-31 1995-02-10 Sony Corp Electrodeposition plating method and device
JP3745887B2 (en) * 1997-09-29 2006-02-15 株式会社タムラ製作所 Jet soldering equipment
JP5704456B2 (en) * 2011-05-31 2015-04-22 日立金属株式会社 Electrolytic aluminum foil production equipment

Also Published As

Publication number Publication date
WO2014185160A1 (en) 2014-11-20

Similar Documents

Publication Publication Date Title
US10946351B2 (en) Paddle, plating apparatus equipped with the paddle, and plating method
JP5981534B2 (en) Substrate plating jig and plating apparatus using the same
TWI695912B (en) Electroplating apparatus with electrolyte agitation
TWI794463B (en) Surface treatment device, surface treatment method and agitator
US9551083B2 (en) Paddle for materials processing
TW201445010A (en) Substrate plating device
US11891698B2 (en) Turbulence-reducing device for stirring a surface treatment solution
TW201447047A (en) Substrate plating device
US4428814A (en) Electroplating apparatus with constant velocity agitation
JP6146657B2 (en) Glue supply device
JP2013022509A (en) Guide plate for impeller and aeration stirring device
JPWO2017047449A1 (en) Coating apparatus and coating method
JP6448115B2 (en) Cooling system
JP6890528B2 (en) Plating device with wave-dissipating member and wave-dissipating member that can be attached to the paddle
TWI663293B (en) Gaseous agitating device of electroplating system
JP5912914B2 (en) Processing equipment
JP2004339590A (en) Surface treatment device
JP6938253B2 (en) Semiconductor manufacturing equipment and processing methods for semiconductor equipment
TW202136594A (en) Paddle, processing apparatus having the paddle, and method of producing the paddle
KR20140003415U (en) Barrel removable detachable mesh network is mounted on the side plates
JP2020151673A (en) Aeration and agitation system, method of installation and oxidation ditch system
JPH07256075A (en) Stirring of dispersion
JP2012144769A (en) Electrodeposition coating device and method
JP2004283782A (en) Aerator
TW201739970A (en) Electroplating device with impulse wave generator comprising a plating bath unit, a vibration generating unit, a vertical power output unit and an impulse wave generator to enhance throwing power