TW201443250A - Cu-Ga alloy sputtering target, cast object for the sputtering target, and manufacturing method thereof - Google Patents

Cu-Ga alloy sputtering target, cast object for the sputtering target, and manufacturing method thereof Download PDF

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TW201443250A
TW201443250A TW103102622A TW103102622A TW201443250A TW 201443250 A TW201443250 A TW 201443250A TW 103102622 A TW103102622 A TW 103102622A TW 103102622 A TW103102622 A TW 103102622A TW 201443250 A TW201443250 A TW 201443250A
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alloy
casting
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TWI545208B (en
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Tomoya Tamura
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Jx Nippon Mining & Metals Corp
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    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34Sputtering
    • C23C14/3407Cathode assembly for sputtering apparatus, e.g. Target
    • C23C14/3414Metallurgical or chemical aspects of target preparation, e.g. casting, powder metallurgy
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B22CASTING; POWDER METALLURGY
    • B22DCASTING OF METALS; CASTING OF OTHER SUBSTANCES BY THE SAME PROCESSES OR DEVICES
    • B22D18/00Pressure casting; Vacuum casting
    • B22D18/06Vacuum casting, i.e. making use of vacuum to fill the mould
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B22CASTING; POWDER METALLURGY
    • B22DCASTING OF METALS; CASTING OF OTHER SUBSTANCES BY THE SAME PROCESSES OR DEVICES
    • B22D21/00Casting non-ferrous metals or metallic compounds so far as their metallurgical properties are of importance for the casting procedure; Selection of compositions therefor
    • B22D21/02Casting exceedingly oxidisable non-ferrous metals, e.g. in inert atmosphere
    • B22D21/025Casting heavy metals with high melting point, i.e. 1000 - 1600 degrees C, e.g. Co 1490 degrees C, Ni 1450 degrees C, Mn 1240 degrees C, Cu 1083 degrees C

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  • Organic Chemistry (AREA)
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  • Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)

Abstract

Disclosed herein is a Cu-Ga alloy cylindrical sputtering target, which is a cylindrical sputtering target of Cu-Ga alloy subjected to melting and casting; the Cu-Ga alloy contains more than 25at% and less than 35at% of Ga, and the rest is composed of Cu and unavoidable impurities, which characterized in that when the cylindrical sputtering target is cut into ring-shaped sections, the cross-section has pores of equal circles with a diameter of 50μm or more, and the number of pores is 0.3 /cm2 or less. In this Cu-Ga alloy target, if the concentration of Ga is above 25at%, the brittleness will be very high, making it very difficult to manufacture by means of melting and casting. Also, although production can be made by sintering powder, due to the high concentration of oxygen and numerous impurities as well, characteristics of solar cells will be undesirably deteriorated. Accordingly, an object of the present invention is to provide a target which does not crack and has reduced number of pores (holes or voids) even if the Ga concentration in the Cu-Ga alloy is within the range of 25at% ~ 35at%.

Description

Cu-Ga合金濺鍍靶、該濺鍍靶用鑄造品及其等之製造方法 Cu-Ga alloy sputtering target, casting product for sputtering target, and the like

本發明係關於一種在形成作為薄膜太陽電池層之光吸收層的Cu-In-Ga-Se(以下,記載為CIGS。)四元系合金薄膜時所使用之細孔(亦稱為空孔或空隙。)經減少的Cu-Ga合金濺鍍靶、該濺鍍靶用鑄造品及其等之製造方法。 The present invention relates to a pore (also referred to as a pore or a pore) used in forming a Cu-In-Ga-Se (hereinafter referred to as CIGS) quaternary alloy thin film as a light absorbing layer of a thin film solar cell layer. Void.) Reduced Cu-Ga alloy sputtering target, casting product for sputtering target, and the like.

近年來,作為薄膜系太陽電池之高效率的CIGS系太陽電池的量產不斷發展,而作為其光吸收層之製造方法,已知有蒸鍍法與硒化法。以蒸鍍法製造之太陽電池雖然有高轉換效率的優點,但是卻具有低成膜速度、高成本、低生產性的缺點,而硒化法較適於產業上大量生產。 In recent years, mass production of high-efficiency CIGS-based solar cells, which are thin-film solar cells, has been progressing, and as a method of producing the light-absorbing layer, a vapor deposition method and a selenization method are known. Although the solar cell manufactured by the vapor deposition method has the advantages of high conversion efficiency, it has the disadvantages of low film formation speed, high cost, and low productivity, and the selenization method is more suitable for mass production in the industry.

硒化法之主要步驟如下。首先,於鈉鈣玻璃基板上形成鉬電極層,於其上濺鍍形成Cu-Ga層與In層後,藉由在氫化硒氣體中之高溫處理,形成CIGS層。利用此硒化法形成CIGS層之步驟中,在濺鍍形成Cu-Ga層時,會使用Cu-Ga靶。 The main steps of the selenization method are as follows. First, a molybdenum electrode layer is formed on a soda lime glass substrate, and after sputtering to form a Cu-Ga layer and an In layer, a CIGS layer is formed by high temperature treatment in a hydrogenated selenium gas. In the step of forming the CIGS layer by this selenization method, a Cu-Ga target is used when the Cu-Ga layer is formed by sputtering.

各種製造條件及構成材料之特性等會對CIGS系太陽電池之轉換效率造成影響,且CIGS膜之特性亦會造成重大影響。 Various manufacturing conditions and characteristics of constituent materials affect the conversion efficiency of CIGS-based solar cells, and the characteristics of CIGS films also have a significant impact.

Cu-Ga靶之製造方法,有熔解法與粉末法。一般而言,用熔解法製造之Cu-Ga靶雖然雜質汚染較少,但亦有缺點。例如,靶中會產生細孔。此會導致在濺鍍時發生異常放電及顆粒(particle)。此係造成膜品質降低之原 因。 The method for producing a Cu-Ga target includes a melting method and a powder method. In general, a Cu-Ga target produced by a melting method has disadvantages in that it has less impurity contamination. For example, fine pores are generated in the target. This can result in abnormal discharge and particles during sputtering. This is the original cause of the film quality reduction because.

又,於熔液冷卻時之最後階段,容易產生縮孔,縮孔周邊部分其特性亦差,會因要加工成既定形狀之原因等而無法使用,故產率差。 Further, at the final stage of the cooling of the molten metal, shrinkage cavities are likely to occur, and the characteristics of the peripheral portion of the shrinkage cavities are also poor, which may be unusable due to processing to a predetermined shape, and the yield is poor.

於用熔解法製造之Cu-Ga靶的相關先前文獻(專利文獻1),雖有未觀察到組成偏析之記載,但完全未揭示分析結果等。又,完全未注意靶中會產生細孔,亦無其解決方法。 In the related literature (Patent Document 1) of the Cu-Ga target produced by the melting method, although the description of the composition segregation is not observed, the analysis results and the like are not disclosed at all. Moreover, there is no attention to the occurrence of fine pores in the target, and there is no solution.

另一方面,用粉末法製作之靶,一般而言具有燒結密度低、雜質濃度高等問題。於Cu-Ga靶相關之專利文獻2,記載有一種燒結體靶,該專利文獻有當切削靶時容易發生裂縫及缺損之脆性相關先前技術的說明,而為了解決此問題,係製造二種類之粉末,將其混合並加以燒結。又,此二種類之粉末,其中一粉末為提高Ga含量之粉末,另一粉末則為減少Ga含量之粉末,形成以晶界相包圍之二相共存組織。 On the other hand, a target produced by a powder method generally has problems such as low sintered density and high impurity concentration. Patent Document 2 related to a Cu-Ga target discloses a sintered body target. The patent document has a description of the prior art relating to brittleness which is prone to cracks and defects when cutting a target, and in order to solve this problem, two types are manufactured. The powder is mixed and sintered. Further, in the powders of the two types, one of the powders is a powder for increasing the Ga content, and the other powder is a powder having a reduced Ga content to form a two-phase coexisting structure surrounded by a grain boundary phase.

此步驟由於製造二種類之粉末,故步驟複雑,且金屬粉末之氧濃度會變高,並無法期待提升燒結體之相對密度。 Since this step produces two types of powders, the steps are repeated, and the oxygen concentration of the metal powder becomes high, and it is not expected to increase the relative density of the sintered body.

密度低、氧濃度高之靶,當然會發生異常放電或顆粒,若濺鍍膜表面有顆粒等異形物,則亦會對隨後之CIGS膜特性造成不良影響,最後非常有可能會導致CIGS太陽電池之轉換效率的大幅下降。 For targets with low density and high oxygen concentration, abnormal discharge or particles will occur. If there are particles and other irregularities on the surface of the sputter film, it will adversely affect the subsequent CIGS film characteristics. Finally, it is likely to cause CIGS solar cells. The conversion efficiency has dropped dramatically.

又,於專利文獻3記載有一種平均結晶粒徑在10μm以下,且氣孔率在0.1%以下之Cu-Ga合金濺鍍靶,可形成膜成分組成之均一性(膜均一性)優異的Cu-Ga濺鍍膜,並說明能減少濺鍍過程中發生電弧(arcing),且強度高,能夠抑制濺鍍過程中之裂縫,對提高緻密性下了工夫,但根本上並無法解決作為燒結體之問題。 Further, Patent Document 3 discloses a Cu-Ga alloy sputtering target having an average crystal grain size of 10 μm or less and a porosity of 0.1% or less, which can form Cu- excellent in uniformity (membrane uniformity) of a film component composition. Ga sputter coating, which shows that arcing can be reduced during sputtering, and the strength is high, and the crack in the sputtering process can be suppressed, and the compactness is reduced, but the problem as a sintered body cannot be solved at all. .

以粉末法製作之Cu-Ga濺鍍靶的大問題,在於步驟複雑,所製作之燒結體由於氧濃度高,雜質量亦多,故會有品質未必良好、生產成本增大之大缺點。從這方面來看,較理想為熔解、鑄造法,但如上所述,在製造會有問題,且亦無法提升靶本身之品質。 A major problem with the Cu-Ga sputtering target produced by the powder method is that the sintered body produced has a high oxygen concentration and a high amount of impurities, so that the quality is not necessarily good and the production cost is increased. From this point of view, it is preferable to be a melting or casting method, but as described above, there is a problem in manufacturing, and the quality of the target itself cannot be improved.

專利文獻1:日本特開2000-73163號公報 Patent Document 1: Japanese Laid-Open Patent Publication No. 2000-73163

專利文獻2:日本特開2008-138232號公報 Patent Document 2: JP-A-2008-138232

專利文獻3:日本特開2010-265544號公報 Patent Document 3: Japanese Laid-Open Patent Publication No. 2010-265544

Cu-Ga合金靶,若Ga濃度在25at%以上,則脆性會非常高,而難以用熔解鑄造來製造。又,雖可用粉末燒結來製造,但由於氧濃度高,雜質量亦多,故會有使太陽電池特性劣化之虞。因此,本案之課題在於提供一種靶,該靶即使是Ga濃度為25at%~35at%之範圍的CuGa合金,亦不會產生裂縫,且細孔(空孔或空隙)減少,因而可進行異常放電等少之良好濺鍍。 When the Ga concentration is 25 at% or more, the Cu-Ga alloy target has a very high brittleness and is difficult to manufacture by melt casting. Further, although it can be produced by powder sintering, since the oxygen concentration is high and the amount of impurities is also large, the characteristics of the solar cell are deteriorated. Therefore, the object of the present invention is to provide a target which does not cause cracks even if the CuGa alloy has a Ga concentration of 25 at% to 35 at%, and the pores (voids or voids) are reduced, so that abnormal discharge can be performed. Wait for a good splash.

為了解決上述課題,本發明人等經潛心研究之結果發現:一種對Ga之成分組成進行調整,並以熔解法熔解、鑄造之圓筒型鑄造品,藉由將熔解條件、HIP條件最佳化,可得到細孔極少之靶,從而完成本發明。 In order to solve the above problems, the inventors of the present invention have found that a cylindrical casting having a composition of Ga and being melted and melted by melting is optimized by melting conditions and HIP conditions. The present invention can be accomplished by obtaining a target having few pores.

由上述見解,本發明提供如下之發明。 From the above findings, the present invention provides the following invention.

1)一種Cu-Ga合金圓筒型鑄造品,係經熔解、鑄造之Cu-Ga合金的圓筒型鑄造品,該Cu-Ga合金之Ga在25at%以上35at%以下,剩餘部分由Cu及不可避免之雜質構成,其特徵在於:將該圓筒型鑄造品切割成輪狀 切片時,橫剖面中具有100μm以上之等圓直徑的細孔其個數在3.5個/cm2以下。 1) A cylindrical cast product of Cu-Ga alloy, which is a cylindrical cast product of a melted and cast Cu-Ga alloy, wherein the Ga of the Cu-Ga alloy is 25 at% or more and 35 at% or less, and the balance is Cu and In the case where the cylindrical cast product is cut into a circular slice, the number of the pores having a circular diameter of 100 μm or more in the cross section is 3.5 pieces/cm 2 or less.

另,所謂細孔之「等圓直徑」,係指與不規則形狀之1個細孔的面積相同面積之圓的直徑,以下亦同。 The "equal diameter" of the pores refers to the diameter of a circle having the same area as the area of one pore of the irregular shape, and the same applies hereinafter.

2)一種Cu-Ga合金圓筒型鑄造品之製造方法,係對Cu-Ga合金進行熔解、鑄造,製造圓筒型鑄造品之方法,該Cu-Ga合金之Ga在25at%以上35at%以下,剩餘部分由Cu及不可避免之雜質構成,其特徵在於:使熔解溫度為該合金之(熔點+100)℃以上1100℃以下,且使真空度為5.0×10-2torr以上之高真空度,進行熔解、鑄造。 2) A method for producing a Cu-Ga alloy cylindrical cast product, which is a method for melting and casting a Cu-Ga alloy to produce a cylindrical cast product, wherein the Ga of the Cu-Ga alloy is 25 at% or more and 35 at% or less The remaining portion is composed of Cu and unavoidable impurities, and is characterized in that the melting temperature is a high degree of vacuum of the alloy (melting point + 100) ° C or more and 1100 ° C or less, and the degree of vacuum is 5.0 × 10 -2 torr or more. , for melting and casting.

3)如上述2)記載之Cu-Ga合金圓筒型鑄造品之製造方法,其係使熔解溫度為該合金之(熔點+100)℃以上1040℃以下。 3) The method for producing a Cu-Ga alloy cylindrical cast product according to the above 2), wherein the melting temperature is (melting point + 100) ° C or more and 1040 ° C or less of the alloy.

4)如上述2)或3)記載之Cu-Ga合金圓筒型鑄造品之製造方法,其中,藉由該製造方法,當將圓筒型鑄造品切割成輪狀切片之情形時,使橫剖面中具有100μm以上之等圓直徑的細孔個數在3.5個/cm2以下。 (4) The method for producing a Cu-Ga alloy cylindrical casting according to the above 2) or 3), wherein the cylindrical casting is cut into a circular section by the manufacturing method, The number of pores having an equi-circle diameter of 100 μm or more in the cross section is 3.5/cm 2 or less.

5)一種Cu-Ga合金圓筒型濺鍍靶,係Ga在25at%以上35at%以下,剩餘部分由Cu及不可避免之雜質構成的Cu-Ga合金濺鍍靶,其特徵在於:該靶中具有50μm以上之等圓直徑的細孔之個數在0.3個/cm2以下。 5) A Cu-Ga alloy cylindrical sputtering target, which is a Cu-Ga alloy sputtering target in which Ga is 25 at% or more and 35 at% or less, and the balance is composed of Cu and unavoidable impurities, and is characterized in that: The number of the pores having an equi-circle diameter of 50 μm or more is 0.3/cm 2 or less.

6)一種Cu-Ga合金圓筒型濺鍍靶之製造方法,係製造Cu-Ga合金濺鍍靶之方法,該Cu-Ga合金之Ga在25at%以上35at%以下,剩餘部分由Cu及不可避免之雜質構成,其特徵在於:當熔解Cu-Ga合金 原料時,使熔解溫度為該合金之(熔點+100)℃以上1100℃以下,且使真空度為5.0×10-2torr以上之高真空度,進行熔解、鑄造,製成Cu-Ga合金圓筒型鑄造品後,以加壓力1500kg/cm2以上、溫度750℃以上熔點之-50℃以下、保持時間2小時以上的條件,對該Cu-Ga合金圓筒型鑄造品進行HIP(熱均壓)處理,進一步加工成靶形狀。 6) A method for manufacturing a Cu-Ga alloy cylindrical sputtering target, which is a method for manufacturing a Cu-Ga alloy sputtering target, wherein the Ga of the Cu-Ga alloy is 25 at% or more and 35 at% or less, and the balance is Cu and The composition of the impurities to be avoided is characterized in that when the Cu-Ga alloy raw material is melted, the melting temperature is set to be (melting point + 100) ° C or more and 1100 ° C or less, and the degree of vacuum is higher than 5.0 × 10 -2 torr or more. The degree of vacuum is melted and cast to obtain a Cu-Ga alloy cylindrical cast product, and the pressure is 1500 kg/cm 2 or more, the temperature is 750 ° C or higher, the melting point is -50 ° C or lower, and the holding time is 2 hours or longer. The Cu-Ga alloy cylindrical cast product is subjected to HIP (thermal pressure equalization) treatment and further processed into a target shape.

7)如上述6)記載之Cu-Ga合金圓筒型濺鍍靶之製造方法,其中,使該熔解溫度為該合金熔點之+100℃以上1040℃以下,且使真空度為5.0×10-3torr以上之高真空度,進行熔解、鑄造,製成Cu-Ga合金圓筒型鑄造品後,以加壓力1500kg/cm2以上、溫度750℃以上(熔點-50)℃以下、保持時間3小時以上的條件,對該Cu-Ga合金圓筒型鑄造品進行HIP處理。 (7) The method for producing a Cu-Ga alloy cylindrical sputtering target according to the above 6), wherein the melting temperature is +100 ° C or more and 1040 ° C or less of the melting point of the alloy, and the degree of vacuum is 5.0 × 10 - After a high vacuum of 3 torr or more, melting and casting are carried out to form a Cu-Ga alloy cylindrical casting, and the pressing force is 1500 kg/cm 2 or more, the temperature is 750 ° C or higher (melting point - 50) ° C or lower, and the holding time is 3 The Cu-Ga alloy cylindrical cast product was subjected to HIP treatment under the conditions of an hour or more.

8)如上述7)記載之Cu-Ga合金圓筒型濺鍍靶之製造方法,其中,藉由該步驟,使具有50μm以上之等圓直徑的細孔個數在0.3個/cm2以下。 (8) The method for producing a Cu-Ga alloy cylindrical sputtering target according to the above (7), wherein the number of pores having a circular diameter of 50 μm or more is 0.3/cm 2 or less.

根據本發明,具有下述優異之效果:可提供一種靶,該靶即使是Ga濃度為25at%~35at%之範圍的CuGa合金,亦不會產生裂縫,且細孔(亦稱為空孔或空隙)減少,因而可進行異常放電等少之良好濺鍍。又,相較於燒結體靶,具有可減少氣體成分之大優點。如此,藉由使用具有氣體成分(氧等)少且細孔發生少之鑄造組織的Cu-Ga合金靶進行濺鍍,可使異常放電及顆粒發生少,能得到均質之Cu-Ga系合金膜,且具有可大幅降低Cu-Ga合金靶之製造成本的效果。由於可由此種濺鍍膜製造光吸收層及CIGS系太陽電池,故具有下述優異之效果:能抑制CIGS太陽電池之轉換效率下降,且可製造低成本之CIGS系太陽電池。 According to the present invention, there is an excellent effect that a target can be provided which does not cause cracks even in a CuGa alloy having a Ga concentration of 25 at% to 35 at%, and pores (also referred to as pores or The voids are reduced, so that good sputtering such as abnormal discharge can be performed. Moreover, compared with the sintered body target, it has the advantage of reducing the gas composition. By using a Cu-Ga alloy target having a cast structure having a small gas component (oxygen or the like) and having few pores, sputtering can be performed, and abnormal discharge and particle generation can be reduced, and a homogeneous Cu-Ga alloy film can be obtained. Moreover, it has an effect of greatly reducing the manufacturing cost of the Cu-Ga alloy target. Since the light absorbing layer and the CIGS-based solar cell can be produced from such a sputtering film, it is excellent in that it can suppress a decrease in conversion efficiency of the CIGS solar cell and can manufacture a low-cost CIGS-based solar cell.

圖1,係顯示發生在鑄造後之組織的細孔其模樣之說明圖。 Fig. 1 is an explanatory view showing the appearance of pores of a tissue which occurs after casting.

圖2,係顯示微孔內部之氣體分析結果的說明圖。 Fig. 2 is an explanatory view showing the results of gas analysis inside the micropores.

圖3,係Cu-H之2元狀態圖。 Figure 3 is a 2-ary state diagram of Cu-H.

圖4,係顯示鑄造方法一例之說明圖。 Fig. 4 is an explanatory view showing an example of a casting method.

圖5,係顯示將圓筒狀鑄造品(鑄件)切割成輪狀切片之例的說明圖。 Fig. 5 is an explanatory view showing an example in which a cylindrical casting (casting) is cut into a circular section.

本發明之Cu-Ga合金圓筒型鑄造品,Ga在25at%以上35at%以下,剩餘部分由Cu及不可避免之雜質構成,為一種將此等合金之原料加以熔解、鑄造之Cu-Ga合金的圓筒型鑄造品。又,當將此圓筒型鑄造品切割成輪狀切片之情形時,使橫剖面中具有100μm以上之等圓直徑的細孔個數在3.5個/cm2以下。 In the Cu-Ga alloy cylindrical casting of the present invention, Ga is 25 at% or more and 35 at% or less, and the balance is composed of Cu and unavoidable impurities, and is a Cu-Ga alloy in which the raw materials of these alloys are melted and cast. Cylindrical castings. Further, when the cylindrical cast product is cut into a circular slice, the number of pores having an equilateral diameter of 100 μm or more in the cross section is 3.5 pieces/cm 2 or less.

藉由使用具有此種鑄造組織之Cu-Ga合金靶進行濺鍍,可減少發生異常放電及顆粒,可得到均質之Cu-Ga系合金膜。並且,當使用以本發明之Cu-Ga合金靶製得之濺鍍膜來製造光吸收層及CIGS系太陽電池時,可抑制CIGS太陽電池之轉換效率下降,且可製造低成本之CIGS系太陽電池。 By performing sputtering using a Cu-Ga alloy target having such a cast structure, abnormal discharge and particles can be reduced, and a homogeneous Cu-Ga-based alloy film can be obtained. Further, when a light-absorbing layer and a CIGS-based solar cell are produced by using the sputtering film obtained by using the Cu-Ga alloy target of the present invention, the conversion efficiency of the CIGS solar cell can be suppressed from being lowered, and a low-cost CIGS-based solar cell can be manufactured. .

Ga含量,係因製造CIGS系太陽電池時形成Cu-Ga合金濺鍍膜之需求而不可或缺者,本發明之Cu-Ga合金濺鍍靶,提供一種Ga在25at%以上35at%以下,剩餘部分由Cu及不可避免之雜質構成的經熔解、鑄造之圓筒型Cu-Ga合金濺鍍靶。 The Ga content is indispensable for the formation of a Cu-Ga alloy sputtering film when manufacturing a CIGS-based solar cell, and the Cu-Ga alloy sputtering target of the present invention provides a Ga at 25 at% or more and 35 at% or less, and the remainder A melted, cast cylindrical Cu-Ga alloy sputtering target consisting of Cu and unavoidable impurities.

以往之燒結品,係以相對密度在95%以上(進一步在98% 以上)作為目標。其原因在於:若相對密度低,則當濺鍍過程中內部空孔顯現於外時,很早就會發生以空孔周邊為起點之濺出(splash)或異常放電導致在膜上產生顆粒或表面凹凸化,而變得容易發生以表面突起(nodule)為起點之異常放電等。鑄造品則可達成相對密度幾乎100%,結果,具有可抑制濺鍍時產生顆粒之效果。此可說是鑄造品的大優點之一。 In the past, the sintered product was at a relative density of 95% or more (further at 98%). Above) as a target. The reason is that if the relative density is low, when the internal pores appear outside during the sputtering process, splash or abnormal discharge starting from the periphery of the pores may cause particles to be generated on the membrane or The surface is roughened, and abnormal discharge or the like starting from a surface nodule is likely to occur. The cast product can achieve a relative density of almost 100%, and as a result, it has an effect of suppressing generation of particles upon sputtering. This can be said to be one of the great advantages of castings.

為了減少濺鍍時之異常放電與顆粒,必須盡可能地消除細孔。然而,於像旋轉靶般之圓筒形狀的情形時,若將熔液注入鑄模內,則會產生100~500μ(微米)單位可用目視確認之大細孔(空孔)。 In order to reduce the abnormal discharge and particles during sputtering, the pores must be eliminated as much as possible. However, in the case of a cylindrical shape like a rotating target, if a molten metal is injected into a mold, large pores (pores) which can be visually confirmed in units of 100 to 500 μm are produced.

圖1顯示鑄造鑄錠之一切割面經研磨過的組織模樣。於圖1之上圖,可確認到以○圍起來的5個細孔(微孔)。而圖1之下圖,則為將其中之一放大的組織照片。主要在結晶組織之晶界可看到細孔。 Figure 1 shows a polished tissue pattern of one of the cut faces of a cast ingot. In the upper view of Fig. 1, it was confirmed that five pores (micropores) surrounded by ○ were observed. The figure below in Figure 1 is a photo of the tissue that magnifies one of them. Fine pores can be seen mainly at the grain boundaries of the crystal structure.

在此空孔內部,主要內含有氫氣。關於細孔內部之氣體分析,係藉由對鑄片一邊以微鑽孔器開孔一邊分析氣體來測量,與未以鑽孔器開孔之背景值比較,可確認存在氫氣。 Inside this hole, hydrogen is mainly contained therein. The gas analysis inside the pores was measured by analyzing the gas while the cast piece was opened with a micro-drill, and it was confirmed that hydrogen gas was present as compared with the background value of the open hole of the drill.

實際之氣體分析,係一直使用氣孔內氣體分析裝置(Nippon Steel Technoresearch)、質量分析計(安內華(ANELVA)製「四極質量分析計」。其結果顯示於圖2。於該圖2,顯示背景值(上圖)與氣體釋出時(下圖)之分析結果。 The actual gas analysis has been carried out using a gas analyzer (Nippon Steel Technoresearch) and a mass spectrometer (a four-pole mass spectrometer manufactured by ANEVA). The results are shown in Fig. 2. In Fig. 2, The background value (top) and the analysis of the gas release (bottom).

氫會在熔解時固溶於銅中,但在凝固過程則會被固相捕捉。因此,一般而言,最後會藉由HIP處理等將微孔去除。 Hydrogen is dissolved in copper during melting, but is captured by the solid phase during solidification. Therefore, in general, the micropores are finally removed by HIP processing or the like.

然而,若每單位面積之空隙存在某一定量以上時,則僅藉由HIP處理的話,並無法完全去除,有時會殘留於鑄錠內部。 However, if there is a certain amount or more in the void per unit area, it may not be completely removed by the HIP treatment, and may remain in the interior of the ingot.

因此,藉由對熔解條件下工夫,亦即,使Ga在25at%以上35at%以下、剩餘部分由Cu構成之Cu-Ga合金的熔解溫度為該同合金之(熔點+100)℃以上1100℃以下(進一步為(熔點+100)℃以上1040℃以下),且使真空度為5.0×10-2torr以上(進一步在5.0×10-3torr以上)之高真空度,進行熔解、鑄造,藉此可減少或去除細孔。 Therefore, the melting temperature of the Cu-Ga alloy in which Ga is 25 at% or more and 35 at% or less and the remainder is made of Cu is the melting temperature of the same alloy (melting point + 100) ° C or more and 1100 ° C or less. (further (melting point + 100) ° C or more and 1040 ° C or less), and a vacuum degree of 5.0 × 10 -2 torr or more (further, 5.0 × 10 -3 torr or more) is performed, and melting and casting are performed. Fine pores can be reduced or removed.

亦即,可在將圓筒型鑄造品切割成輪狀切片之情形時,使橫剖面中具有100μm以上之等圓直徑的細孔個數在3.5個/cm2以下。 In other words, when the cylindrical cast product is cut into a circular slice, the number of pores having an equilateral diameter of 100 μm or more in the cross section is 3.5 pieces/cm 2 or less.

合金之熔點,可從Cu-Ga之二元系狀態圖求得(參考資料:ASM之Binary Alloy database)。例如,當Ga為25at%之情形時,根據Cu-Ga之二元系狀態圖,熔點為890℃。 The melting point of the alloy can be determined from the binary state diagram of Cu-Ga (Reference: ASM Binary Alloy database). For example, when Ga is 25 at%, the melting point is 890 ° C according to the binary system state diagram of Cu-Ga.

此情形時,若熔解溫度超過1100℃,則液相中之氫溶解度會變高,而無法充分去除。更佳宜使熔解溫度在1040℃以下。又,即使真空度在5×10-3torr以上,氣體成分亦會在熔解過程中固溶,無法去除,故較佳為上述之條件。 In this case, if the melting temperature exceeds 1100 ° C, the solubility of hydrogen in the liquid phase becomes high and cannot be sufficiently removed. More preferably, the melting temperature is below 1040 °C. Further, even if the degree of vacuum is 5 × 10 -3 torr or more, the gas component is solid-solved during the melting process and cannot be removed, so the above conditions are preferred.

圖3顯示Cu-H之2元狀態圖。Cu之氫固溶限度,約1075℃之0.2at%,溫度越低則越少。又,若超過熔點1084℃,則熔解度會增加3倍,達到0.6at%。因此,宜在上述之溫度範圍。 Figure 3 shows a 2-ary state diagram of Cu-H. The hydrogen solid solution limit of Cu is 0.2 at% of about 1075 ° C, and the lower the temperature, the less. Moreover, if it exceeds the melting point of 1084 ° C, the degree of melting increases by a factor of three to 0.6 at%. Therefore, it is preferred to be in the above temperature range.

當製造Cu-Ga合金圓筒型濺鍍靶時,如上述,使Ga在25at%以上35at%以下、剩餘部分由Cu構成之原料的熔解溫度為該合金之(熔點+100)℃以上1100℃以下(更佳為~1040℃以下),且使真空度為5.0×10-2torr以上之高真空度,進行熔解、鑄造製成Cu-Ga合金圓筒型鑄造品後,以加壓力1500kg/cm2以上、溫度750℃以上(熔點-50)℃以下、保持時 間2小時以上(更佳為3小時以上)之條件,對該Cu-Ga合金圓筒型鑄造品進行HIP處理,並且加工成靶形狀,藉此可得到該靶中具有50μm以上之等圓直徑的細孔其個數在0.3個/cm2以下的Cu-Ga合金圓筒型濺鍍靶。 When a Cu-Ga alloy cylindrical sputtering target is produced, as described above, a melting temperature of a material having a Ga content of 25 at% or more and 35 at% or less and a remainder of Cu is a melting point of the alloy (melting point + 100) ° C or more and 1100 ° C. The following (more preferably, it is less than 1040 ° C), and the vacuum degree is a vacuum degree of 5.0 × 10 -2 torr or more, and after melting and casting to form a Cu-Ga alloy cylindrical casting, the pressing force is 1500 kg/ The Cu-Ga alloy cylindrical casting product is subjected to HIP treatment and processed into a condition of cm 2 or more, a temperature of 750 ° C or more (melting point - 50) ° C or less, and a holding time of 2 hours or more (more preferably 3 hours or more). By the shape of the target, a Cu-Ga alloy cylindrical sputtering target having a number of pores having an equilateral diameter of 50 μm or more in the target of 0.3/cm 2 or less can be obtained.

此HIP處理,若加壓未達1500kg/cm2,則細孔不會充分消除,若溫度未達750℃,則氣體成分不會擴散,因而殘留。又,必須要使高溫之溫度保持時間在一定時間以上。具體而言,宜在2小時以上,更理想在3小時以上。若高溫之溫度保持時間不足,則細孔內含之氣體成分不會充分擴散,細孔(空孔)殘留會變多。 In the HIP treatment, if the pressure is less than 1500 kg/cm 2 , the pores are not sufficiently eliminated, and if the temperature is less than 750 ° C, the gas component does not diffuse and remains. Moreover, it is necessary to keep the temperature of the high temperature for a certain period of time or longer. Specifically, it is preferably 2 hours or longer, more preferably 3 hours or longer. When the temperature holding time of the high temperature is insufficient, the gas components contained in the pores are not sufficiently diffused, and the pores (pores) remain more.

圖4顯示Cu-Ga合金之熔解鑄造例。以成為既定之CuGa合金組成的方式,在石墨製坩堝內,熔解Cu、Ga之原料例如約25kg。為了去除水分,可用燃燒器烘烤石墨製餵槽約1小時。 Fig. 4 shows an example of melt casting of a Cu-Ga alloy. In the form of a predetermined composition of CuGa alloy, a raw material for melting Cu and Ga is, for example, about 25 kg in a graphite crucible. In order to remove moisture, a graphite feed tank can be baked with a burner for about one hour.

將具備有核心之石墨製鑄模(例如,外徑165,內徑125,高度400mm)與餵槽設置在腔室內。抽真空至既定的真空度後,藉由感應加熱,加熱坩堝,將原料熔解。然後,於到達既定溫度之時點,透過餵槽,注入鑄模,製造圓筒型Cu-Ga合金鑄錠。 Will have a core graphite mold (for example, OD 165 , inner diameter 125 , height 400mm) and the feeding trough are arranged in the chamber. After evacuating to a predetermined degree of vacuum, the crucible is heated by induction heating to melt the raw material. Then, at a point where the predetermined temperature is reached, the casting mold is injected through the feeding tank to produce a cylindrical Cu-Ga alloy ingot.

於評價圓筒型Cu-Ga合金鑄錠時,如圖5所示,將約300mm長之圓筒狀鑄造品(鑄件),例如將距離上面50mm、150mm、250mm之位置的3個部位切割成輪狀切片,使各切片之厚度為10mm。另,在切割成輪狀切片時,如圖5,係切割成使剖面方向垂直接近長度方向之方向(不斜切)。 When evaluating a cylindrical Cu-Ga alloy ingot, as shown in FIG. 5, a cylindrical casting (casting) having a length of about 300 mm is cut into three parts at positions of 50 mm, 150 mm, and 250 mm from the top. The slices were sliced so that the thickness of each slice was 10 mm. Further, when cutting into a circular slice, as shown in Fig. 5, it is cut so that the cross-sectional direction is perpendicular to the longitudinal direction (not beveled).

用#400之研磨紙研磨以此方式得到之鑄錠。然後,計數存在剖面之細孔個數,確認是否滿足本發明之要件。 The ingot obtained in this manner was ground using #400 abrasive paper. Then, the number of pores in the cross section is counted to confirm whether or not the requirements of the present invention are satisfied.

並且,進行熔解、鑄造,使加壓力在1500kg/cm2以上,溫度在750℃至熔點-50℃之範圍,保持時間在2小時以上(視需要,使在3小時以上),對Cu-Ga合金圓筒型鑄造品(鑄錠)進行HIP處理加工成靶,藉此,可得到該靶中具有50μm以上之等圓直徑的細孔其個數在0.3個/cm2以下的Cu-Ga合金圓筒型濺鍍靶。進一步亦可使該細孔個數為0個/cm2Further, melting and casting are carried out so that the pressing force is 1500 kg/cm 2 or more, the temperature is in the range of 750 ° C to the melting point - 50 ° C, and the holding time is 2 hours or longer (if necessary, more than 3 hours), for Cu-Ga cylindrical castings alloy (ingot) subjected to HIP treatment is processed into a target, whereby the target can be obtained having a pore diameter of 50μm and the like of more or less Cu-Ga alloy in which the number of 0.3 / cm Cylindrical sputtering target. Further, the number of the pores may be 0/cm 2 .

以上述方式製造之濺鍍靶,例如使濺鍍功率為直流(DC)1000W,環境氣體為氬,氣體流量為50scm,濺鍍時壓力為0.5Pa時,可使濺鍍時間5小時後至6小時後之間的1小時中的異常放電數在10次以下,較佳可在5次以下。 The sputtering target manufactured in the above manner, for example, has a sputtering power of direct current (DC) of 1000 W, an ambient gas of argon, a gas flow rate of 50 scm, and a sputtering pressure of 0.5 Pa, which allows the sputtering time to be 5 hours to 6 The number of abnormal discharges in one hour between hours is 10 or less, preferably 5 or less.

如上所示,藉由控制鑄造條件,並以適當條件實施HIP處理,可得到下述之CuGa合金旋轉靶:即使Ga濃度在25~35at%之範圍,靶亦不會產生裂縫,且因減少微孔而使異常放電數減少。 As described above, by controlling the casting conditions and performing the HIP treatment under appropriate conditions, the following CuGa alloy rotating target can be obtained: even if the Ga concentration is in the range of 25 to 35 at%, the target does not cause cracks, and the micro-reduction is caused. The hole reduces the number of abnormal discharges.

[實施例] [Examples]

接著,說明本發明之實施例。另,本實施例僅為一例示,本發明並不受實施例之限制。亦即,在本發明之技術思想範圍內,包含所有可從說明書整體掌握之發明及實施例以外之態樣或變形。 Next, an embodiment of the present invention will be described. In addition, this embodiment is only an example, and the invention is not limited by the embodiment. That is, all aspects or modifications other than the invention and the embodiments that can be grasped from the specification are included in the scope of the technical idea of the present invention.

(實施例1) (Example 1)

使用圖4所示之鑄造裝置,將25kg之原料放入碳製坩堝,使腔室內成為5×10-3torr之真空環境,以感應加熱將坩堝加熱至1100℃,上述原料,係將添加元素Ga(純度:4N)調整成Ga濃度為25at%之組成比,剩餘部分為銅(Cu:純度4N)之原料。 Using the casting apparatus shown in Fig. 4, 25 kg of the raw material was placed in a carbon crucible, and the chamber was brought into a vacuum environment of 5 × 10 -3 torr, and the crucible was heated to 1100 ° C by induction heating. Ga (purity: 4N) was adjusted to a composition ratio of Ga concentration of 25 at%, and the remainder was a raw material of copper (Cu: purity 4N).

將原料完全熔解後,於腔室內部導入氬氣,使熔液溫度下降至990℃, 於熔液溫度穩定時,開始放液。以後,使此時之溫度為放液溫度。放液係以透過餵槽注入鑄模之方法來進行。熔解時所使用之坩堝的形狀為320mm×400mm,鑄模為外徑165,內徑125,高度400mm。 After the raw material was completely melted, argon gas was introduced into the chamber to lower the temperature of the melt to 990 ° C, and when the melt temperature was stable, liquid discharge was started. Thereafter, the temperature at this time is the discharge temperature. The liquid discharge is performed by a method of injecting a mold through a feed tank. The shape of the crucible used in the melting is 320mm ×400mm , the mold is OD 165 , inner diameter 125 , height 400mm.

於鑄造後,自鑄模取出鑄錠,將所製得之300mm長的圓筒狀鑄件,距離上面50mm、150mm、250mm之位置的3個部位切割成輪狀切片,使各切片之厚度為10mm。用#400之研磨紙研磨以此方式所得之鑄錠後,確認存在剖面之具有100μ以上之等圓直徑的細孔個數,結果每單位cm2有0.8個。 After casting, the ingot was taken out from the mold, and the cylindrical casting having a length of 300 mm was cut into three pieces at a position of 50 mm, 150 mm, and 250 mm from the top, and the thickness of each slice was 10 mm. After the ingot obtained in this manner was polished with a #400 abrasive paper, it was confirmed that the number of pores having a circular diameter of 100 μ or more in the cross section was found to be 0.8 per unit cm 2 .

進一步以加壓力1500kg/cm2、溫度750℃、保持時間3小時之條件,對此圓筒型物實施HIP處理。結果,鑄件完全不存在具有50μm以上之等圓直徑的細孔(0個),滿足0.3個/cm2以下。其結果示於表1。 Further, the cylindrical article was subjected to HIP treatment under the conditions of a pressure of 1500 kg/cm 2 , a temperature of 750 ° C, and a holding time of 3 hours. As a result, casting pores completely (0) and the like having a diameter of above 50μm does not exist, satisfying 0.3 / cm 2 or less. The results are shown in Table 1.

將此圓筒型鑄件加工成圓筒狀之內徑135mm、外徑150mm、長度75mm2條,接合在鈦製支承管(backing tube),製成2段且總長為150mm之濺鍍靶,然後進行濺鍍。使濺鍍功率為直流(DC)1000W,環境氣體為氬,氣體流量為50sccm,濺鍍時壓力為0.5Pa。計數濺鍍時間5小時後至6小時後之間的1小時中的異常放電數,結果為0次。藉此,可達成本案之目的。其結果示於表1。 The cylindrical casting was machined into a cylindrical inner diameter of 135 mm, an outer diameter of 150 mm, and a length of 75 mm, and joined to a titanium backing tube to form a two-stage sputtering target having a total length of 150 mm. Sputtering. The sputtering power was 1000 W of direct current (DC), the ambient gas was argon, the gas flow rate was 50 sccm, and the pressure at the time of sputtering was 0.5 Pa. The number of abnormal discharges in one hour between 5 hours and 6 hours after the sputtering time was counted, and the result was 0 times. Thereby, the purpose of the cost case can be reached. The results are shown in Table 1.

(比較例1) (Comparative Example 1)

對與實施例1同樣方式鑄造之圓筒型鑄件,以加壓力1500kg/cm2、溫度650℃、保持時間3小時之條件,實施HIP處理。存在鑄件之具有50μm以上之等圓直徑的細孔個數,每單位cm2為0.5個。係以與實施例1不同之HIP條件(低溫)進行處理者,細孔數增加。其結果同樣示於表1。以與實施例1同樣條件進行濺鍍,結果異常放電數為12次,為異常放電多之結果。 The cylindrical casting cast in the same manner as in Example 1 was subjected to HIP treatment under the conditions of a pressing force of 1500 kg/cm 2 , a temperature of 650 ° C, and a holding time of 3 hours. There is a number of pores having a circular diameter of 50 μm or more in the casting, and 0.5 per unit cm 2 . When the treatment was carried out under the HIP condition (low temperature) different from that of Example 1, the number of pores was increased. The results are also shown in Table 1. Sputtering was carried out under the same conditions as in Example 1. As a result, the number of abnormal discharges was 12, which was a result of a large number of abnormal discharges.

(實施例2) (Example 2)

除了使放液溫度為1040℃以外,對與實施例1同樣方式鑄造之圓筒型鑄件,以加壓力1500kg/cm2、溫度750℃、保持時間3小時之條件,實施HIP處理。存在鑄件之具有50μm以上之等圓直徑的細孔個數,每單位cm2為1.4個,HIP後之細孔個數,每單位cm2為0個,滿足0.3個/cm2以下。其結果示於表1。以與實施例1同樣條件進行濺鍍,結果異常放電數為0次。藉此,可達成本案之目的。其結果示於表1。 The cylindrical casting cast in the same manner as in Example 1 was subjected to a HIP treatment under the conditions of a pressing force of 1500 kg/cm 2 , a temperature of 750 ° C and a holding time of 3 hours, except that the discharge temperature was 1040 ° C. There are the number of pores having a circular diameter of 50 μm or more in the casting, 1.4 per unit cm 2 , and the number of pores after HIP is 0 per unit cm 2 , which satisfies 0.3/cm 2 or less. The results are shown in Table 1. Sputtering was carried out under the same conditions as in Example 1. As a result, the number of abnormal discharges was 0. Thereby, the purpose of the cost case can be reached. The results are shown in Table 1.

(比較例2) (Comparative Example 2)

對與實施例2同樣方式鑄造之圓筒型鑄件,以加壓力1500kg/cm2、溫度650℃、保持時間3小時之條件,實施HIP處理。存在鑄件之具有50μm以上之等圓直徑的細孔個數,每單位cm2為1.4個,HIP後之細孔個數,每單位cm2為0.5個。 The cylindrical casting cast in the same manner as in Example 2 was subjected to HIP treatment under the conditions of a pressing pressure of 1500 kg/cm 2 , a temperature of 650 ° C, and a holding time of 3 hours. There are the number of pores having a circular diameter of 50 μm or more in the casting, 1.4 per unit cm 2 , and the number of pores after HIP is 0.5 per unit cm 2 .

係以與實施例2不同之HIP條件(低溫)進行處理者,細孔數增加。其結果同樣示於表1。以與實施例1同樣條件進行濺鍍,結果異常放電數為20次,為異常放電多之結果。 When the treatment was carried out under the HIP condition (low temperature) different from that of Example 2, the number of pores was increased. The results are also shown in Table 1. Sputtering was carried out under the same conditions as in Example 1. As a result, the number of abnormal discharges was 20, which was a result of a large number of abnormal discharges.

(實施例3) (Example 3)

除了使放液溫度為1100℃以外,對與實施例1同樣方式鑄造之圓筒型鑄件,以加壓力1500kg/cm2、溫度750℃、保持時間3小時之條件,實施HIP處理。存在鑄件之具有50μm以上之等圓直徑的細孔個數,每單位cm2為3.2個,HIP後之細孔個數,每單位cm2為0.2個,滿足0.3個/cm2以下。其結果示於表1。以與實施例1同樣條件進行濺鍍,結果異常放電數為2次。藉此,可達成本案之目的。其結果示於表1。 The cylindrical casting cast in the same manner as in Example 1 was subjected to HIP treatment under the conditions of a pressing force of 1500 kg/cm 2 , a temperature of 750 ° C and a holding time of 3 hours, except that the discharge temperature was 1,100 ° C. There are the number of pores having a circular diameter of 50 μm or more in the casting, 3.2 per unit cm 2 , and the number of pores after HIP is 0.2 per unit cm 2 , which satisfies 0.3/cm 2 or less. The results are shown in Table 1. Sputtering was carried out under the same conditions as in Example 1. As a result, the number of abnormal discharges was two. Thereby, the purpose of the cost case can be reached. The results are shown in Table 1.

(比較例3) (Comparative Example 3)

除了形成低真空度5×10-1torr(放液前之真空度)以外,對與實施例3同樣方式鑄造之圓筒型鑄件,以加壓力1500kg/cm2、溫度750℃、保持時間3小時之條件,實施HIP處理。存在鑄件之具有50μm以上之等圓直徑的細孔個數,每單位cm2為4.5個,HIP後之細孔個數,每單位cm2為0.6個。 A cylindrical casting cast in the same manner as in Example 3 was applied at a pressure of 1500 kg/cm 2 , a temperature of 750 ° C, and a holding time of 3, except that a low vacuum of 5 × 10 -1 torr (vacuum degree before liquid discharge) was formed. Under the condition of hours, HIP processing is implemented. There are the number of pores having a circular diameter of 50 μm or more in the casting, 4.5 per unit cm 2 , and the number of pores after HIP is 0.6 per unit cm 2 .

如上述,係以與實施例3不同之真空度(低真空)進行處理者,細孔數增加。其結果同樣示於表1。以與實施例1同樣條件進行濺鍍,結果異常放電數為36次,為異常放電多之結果。 As described above, when the degree of vacuum (low vacuum) different from that of Example 3 was used, the number of pores increased. The results are also shown in Table 1. Sputtering was carried out under the same conditions as in Example 1. As a result, the number of abnormal discharges was 36, which was a result of abnormal discharge.

(實施例4) (Example 4)

將添加元素Ga(純度:4N)調整成Ga濃度為30at%之組成比,以與實施例1同樣方式將原料完全熔解。 The additive element Ga (purity: 4N) was adjusted to have a composition ratio of Ga concentration of 30 at%, and the raw material was completely melted in the same manner as in Example 1.

於原料完全熔解後,將氬氣導入腔室內部,將熔液溫度降低至950℃,在熔液溫度穩定時,開始放液。放液方法、鑄模之尺寸與實施例1相同。 After the raw material was completely melted, argon gas was introduced into the chamber to lower the temperature of the melt to 950 ° C, and when the melt temperature was stable, liquid discharge was started. The size of the liquid discharge method and the mold was the same as in the first embodiment.

對鑄造之圓筒型鑄件,以加壓力1500kg/cm2、溫度750℃、保持時間2小時之條件,實施HIP處理。存在鑄件之具有50μm以上之等圓直徑的細孔個數,每單位cm2為1.3個,HIP後之細孔個數,每單位cm2為0.1個,滿 足0.3個/cm2以下。其結果示於表1。以與實施例1同樣條件進行濺鍍,結果異常放電數為2次。藉此,可達成本案之目的。其結果示於表1。 For the cast cylindrical casting, HIP treatment was carried out under the conditions of a pressing force of 1500 kg/cm 2 , a temperature of 750 ° C, and a holding time of 2 hours. There are the number of pores having a circular diameter of 50 μm or more in the casting, 1.3 per unit cm 2 , and the number of pores after HIP is 0.1 per unit cm 2 , which satisfies 0.3/cm 2 or less. The results are shown in Table 1. Sputtering was carried out under the same conditions as in Example 1. As a result, the number of abnormal discharges was two. Thereby, the purpose of the cost case can be reached. The results are shown in Table 1.

(比較例4) (Comparative Example 4)

對與實施例4同樣方式鑄造之圓筒型鑄件,以加壓力1500kg/cm2、溫度650℃、保持時間3小時之條件,實施HIP處理。存在鑄件之具有50μm以上之等圓直徑的細孔個數,每單位cm2為1.3個,HIP後之細孔個數,每單位cm2為0.6個。 The cylindrical casting cast in the same manner as in Example 4 was subjected to HIP treatment under the conditions of a pressing pressure of 1500 kg/cm 2 , a temperature of 650 ° C, and a holding time of 3 hours. There are the number of pores having a circular diameter of 50 μm or more in the casting, 1.3 per unit cm 2 , and the number of pores after HIP is 0.6 per unit cm 2 .

係以與實施例4不同之HIP條件(低溫)進行處理者,細孔數增加。其結果同樣示於表1。以與實施例1同樣條件進行濺鍍,結果異常放電數為32次,為異常放電多之結果。 When the treatment was carried out under the HIP condition (low temperature) different from that of Example 4, the number of pores was increased. The results are also shown in Table 1. Sputtering was carried out under the same conditions as in Example 1. As a result, the number of abnormal discharges was 32, which was a result of abnormal discharge.

(實施例5) (Example 5)

對與實施例4同樣方式鑄造之圓筒型鑄件,以加壓力1500kg/cm2、溫度800℃、保持時間3小時之條件,實施HIP處理。存在鑄件之具有50μm以上之等圓直徑的細孔個數,每單位cm2為1.3個,HIP後之細孔個數,每單位cm2為0個,滿足0.3個/cm2以下。其結果示於表1。以與實施例1同樣條件進行濺鍍,結果異常放電數為1次。藉此,可達成本案之目的。其結果示於表1。 The cylindrical casting cast in the same manner as in Example 4 was subjected to HIP treatment under the conditions of a pressing pressure of 1500 kg/cm 2 , a temperature of 800 ° C, and a holding time of 3 hours. There are the number of pores having a circular diameter of 50 μm or more in the casting, 1.3 per unit cm 2 , and the number of pores after HIP is 0 per unit cm 2 , which satisfies 0.3/cm 2 or less. The results are shown in Table 1. Sputtering was carried out under the same conditions as in Example 1. As a result, the number of abnormal discharges was one. Thereby, the purpose of the cost case can be reached. The results are shown in Table 1.

(實施例6) (Example 6)

除了使真空度為5×10-2torr之真空環境以外,對與實施例4同樣方式鑄造之圓筒型鑄件,以加壓力1500kg/cm2、溫度750℃、保持時間4小時之條件,實施HIP處理。存在鑄件之具有50μm以上之等圓直徑的細孔個數,每單位cm2為3.2個,HIP後之細孔個數,每單位cm2為0.2個,滿足0.3個 /cm2以下。其結果示於表1。以與實施例1同樣條件進行濺鍍,結果異常放電數為2次。藉此,可達成本案之目的。其結果示於表1。 A cylindrical casting cast in the same manner as in Example 4 was carried out under the conditions of a pressing force of 1500 kg/cm 2 , a temperature of 750 ° C, and a holding time of 4 hours, except that the vacuum was 5 × 10 -2 torr. HIP processing. There are the number of pores having a circular diameter of 50 μm or more in the casting, 3.2 per unit cm 2 , and the number of pores after HIP is 0.2 per unit cm 2 , which satisfies 0.3/cm 2 or less. The results are shown in Table 1. Sputtering was carried out under the same conditions as in Example 1. As a result, the number of abnormal discharges was two. Thereby, the purpose of the cost case can be reached. The results are shown in Table 1.

(實施例7) (Example 7)

除了使放液溫度為1040℃以外,對與實施例4同樣方式鑄造之圓筒型鑄件,以加壓力1500kg/cm2、溫度750℃、保持時間3小時之條件,實施HIP處理。存在鑄件之具有50μm以上之等圓直徑的細孔個數,每單位cm2為2.2個,HIP後之細孔個數,每單位cm2為0.3個,滿足0.3個/cm2以下。其結果示於表1。以與實施例1同樣條件進行濺鍍,結果異常放電數為4次。藉此,可達成本案之目的。其結果示於表1。 The cylindrical casting cast in the same manner as in Example 4 was subjected to HIP treatment under the conditions of a pressing force of 1500 kg/cm 2 , a temperature of 750 ° C and a holding time of 3 hours, except that the discharge temperature was 1040 ° C. There are the number of pores having a circular diameter of 50 μm or more in the casting, 2.2 per unit cm 2 , and the number of pores after HIP is 0.3 per unit cm 2 , which satisfies 0.3/cm 2 or less. The results are shown in Table 1. Sputtering was carried out under the same conditions as in Example 1. As a result, the number of abnormal discharges was four. Thereby, the purpose of the cost case can be reached. The results are shown in Table 1.

(比較例5) (Comparative Example 5)

對與實施例7同樣方式鑄造之圓筒型鑄件,以加壓力1500kg/cm2、溫度650℃、保持時間3小時之條件,實施HIP處理。存在鑄件之具有50μm以上之等圓直徑的細孔個數,每單位cm2為2.2個,HIP後之細孔個數,每單位cm2為0.8個。 The cylindrical casting cast in the same manner as in Example 7 was subjected to HIP treatment under the conditions of a pressing force of 1500 kg/cm 2 , a temperature of 650 ° C, and a holding time of 3 hours. There are the number of pores having a circular diameter of 50 μm or more in the casting, 2.2 per unit cm 2 , and the number of pores after HIP is 0.8 per unit cm 2 .

係以與實施例7不同之HIP條件(低溫)進行處理者,細孔數增加。其結果同樣示於表1。以與實施例1同樣條件進行濺鍍,結果異常放電數為64次,為異常放電多之結果。 When the treatment was carried out under the HIP condition (low temperature) different from that of Example 7, the number of pores was increased. The results are also shown in Table 1. Sputtering was carried out under the same conditions as in Example 1. As a result, the number of abnormal discharges was 64, which was a result of abnormal discharge.

(比較例6) (Comparative Example 6)

對與實施例7同樣方式鑄造之圓筒型鑄件,以加壓力1500kg/cm2、溫度750℃、保持時間1小時之條件,實施HIP處理。存在鑄件之具有50μm以上之等圓直徑的細孔個數,每單位cm2為2.2個,HIP後之細孔個數,每單位cm2為0.5個。 The cylindrical casting cast in the same manner as in Example 7 was subjected to HIP treatment under the conditions of a pressing force of 1500 kg/cm 2 , a temperature of 750 ° C, and a holding time of 1 hour. There are the number of pores having a circular diameter of 50 μm or more in the casting, 2.2 per unit cm 2 , and the number of pores after HIP is 0.5 per unit cm 2 .

係以與實施例7不同之HIP條件(短時間)進行處理者,細孔數增加。其結果同樣示於表1。以與實施例1同樣條件進行濺鍍,結果異常放電數為26次,為異常放電多之結果。 When the treatment was carried out under the HIP condition (short time) different from that of Example 7, the number of pores was increased. The results are also shown in Table 1. Sputtering was carried out under the same conditions as in Example 1. As a result, the number of abnormal discharges was 26, which was a result of a large number of abnormal discharges.

(實施例8) (Example 8)

除了使真空度為5×10-4torr以外,對與實施例7同樣方式鑄造之圓筒型鑄件,以加壓力1500kg/cm2、溫度750℃、保持時間2小時之條件,實施HIP處理。存在鑄件之具有50μm以上之等圓直徑的細孔個數,每單位cm2為1.8個,HIP後之細孔個數,每單位cm2為0個,滿足0.3個/cm2以下。其結果示於表1。以與實施例1同樣條件進行濺鍍,結果異常放電數為1次。藉此,可達成本案之目的。其結果示於表1。 The cylindrical casting cast in the same manner as in Example 7 was subjected to HIP treatment under the conditions of a pressing force of 1500 kg/cm 2 , a temperature of 750 ° C and a holding time of 2 hours, except that the degree of vacuum was 5 × 10 -4 torr. There is a number of pores having a circular diameter of 50 μm or more in the casting, 1.8 per unit cm 2 , and the number of pores after HIP is 0 per unit cm 2 , and satisfies 0.3 pieces/cm 2 or less. The results are shown in Table 1. Sputtering was carried out under the same conditions as in Example 1. As a result, the number of abnormal discharges was one. Thereby, the purpose of the cost case can be reached. The results are shown in Table 1.

(實施例9) (Example 9)

除了使真空度為5×10-2torr以外,對與實施例7同樣方式鑄造之圓筒型鑄件,以加壓力1500kg/cm2、溫度750℃、保持時間3小時之條件,實施HIP處理。存在鑄件之具有50μm以上之等圓直徑的細孔個數,每單位cm2為4.0個,HIP後之細孔個數,每單位cm2為0.3個,滿足0.3個/cm2以下。其結果示於表1。以與實施例1同樣條件進行濺鍍,結果異常放電數為3次。藉此,可達成本案之目的。其結果示於表1。 The cylindrical casting cast in the same manner as in Example 7 was subjected to HIP treatment under the conditions of a pressing force of 1500 kg/cm 2 , a temperature of 750 ° C and a holding time of 3 hours, except that the degree of vacuum was 5 × 10 -2 torr. There are the number of pores having a circular diameter of 50 μm or more in the casting, 4.0 per unit cm 2 , and the number of pores after HIP is 0.3 per unit cm 2 , which satisfies 0.3/cm 2 or less. The results are shown in Table 1. Sputtering was carried out under the same conditions as in Example 1. As a result, the number of abnormal discharges was three. Thereby, the purpose of the cost case can be reached. The results are shown in Table 1.

(實施例10) (Embodiment 10)

除了使放液溫度為1050℃以外,對與實施例4同樣方式鑄造之圓筒型鑄件,以加壓力1500kg/cm2、溫度800℃、保持時間3小時之條件,實施HIP處理。存在鑄件之具有50μm以上之等圓直徑的細孔個數,每單位cm2為3.1個,HIP後之細孔個數,每單位cm2為0.2個,滿足0.3個/cm2以下。 其結果示於表1。以與實施例1同樣條件進行濺鍍,結果異常放電數為2次。藉此,可達成本案之目的。其結果示於表1。 The cylindrical casting cast in the same manner as in Example 4 was subjected to a HIP treatment under the conditions of a pressing force of 1500 kg/cm 2 , a temperature of 800 ° C, and a holding time of 3 hours, except that the discharge temperature was 1050 ° C. There are the number of pores having a circular diameter of 50 μm or more in the casting, 3.1 per unit cm 2 , and the number of pores after HIP is 0.2 per unit cm 2 , which satisfies 0.3/cm 2 or less. The results are shown in Table 1. Sputtering was carried out under the same conditions as in Example 1. As a result, the number of abnormal discharges was two. Thereby, the purpose of the cost case can be reached. The results are shown in Table 1.

(比較例7) (Comparative Example 7)

除了將熔解溫度提高至1180℃而直接放液以外,對與實施例4同樣方式鑄造之圓筒型鑄件,以加壓力1500kg/cm2、溫度750℃、保持時間3小時之條件,實施HIP處理。存在鑄件之具有50μm以上之等圓直徑的細孔個數,每單位cm2為4.3個,HIP後之細孔個數,每單位cm2為0.5個。 The cylindrical casting cast in the same manner as in Example 4 was subjected to HIP treatment under the conditions of a pressing force of 1500 kg/cm 2 , a temperature of 750 ° C and a holding time of 3 hours, except that the melting temperature was raised to 1,180 ° C and the liquid was directly discharged. . There are the number of pores having a circular diameter of 50 μm or more in the casting, 4.3 per unit cm 2 , and the number of pores after HIP is 0.5 per unit cm 2 .

係以與實施例4不同之熔解、放液溫度(高溫)進行處理者,細孔數增加。其結果同樣示於表1。以與實施例1同樣條件進行濺鍍,結果異常放電數為28次,為異常放電多之結果。 When the treatment was carried out at a melting temperature (high temperature) different from that of Example 4, the number of pores increased. The results are also shown in Table 1. Sputtering was carried out under the same conditions as in Example 1. As a result, the number of abnormal discharges was 28, which was a result of a large number of abnormal discharges.

(比較例8) (Comparative Example 8)

除了使放液溫度為1200℃以外,對與實施例4同樣方式鑄造之圓筒型鑄件,以加壓力1500kg/cm2、溫度750℃、保持時間3小時之條件,實施HIP處理。存在鑄件之具有50μm以上之等圓直徑的細孔個數,每單位cm2為5.4個,HIP後之細孔個數,每單位cm2為0.7個。 The cylindrical casting cast in the same manner as in Example 4 was subjected to HIP treatment under the conditions of a pressing force of 1500 kg/cm 2 , a temperature of 750 ° C and a holding time of 3 hours, except that the discharge temperature was 1200 ° C. There are the number of pores having a circular diameter of 50 μm or more in the casting, 5.4 per unit cm 2 , and the number of pores after HIP is 0.7 per unit cm 2 .

係以與實施例4不同之放液溫度(高溫)進行處理者,細孔數增加。其結果同樣示於表1。以與實施例1同樣條件進行濺鍍,結果異常放電數為49次,為異常放電多之結果。 When the treatment was carried out at a discharge temperature (high temperature) different from that of Example 4, the number of pores was increased. The results are also shown in Table 1. Sputtering was carried out under the same conditions as in Example 1. As a result, the number of abnormal discharges was 49, which was a result of a large number of abnormal discharges.

(實施例11) (Example 11)

將添加元素Ga(純度:4N)調整成Ga濃度為35at%之組成比,以與實施例1同樣方式將原料完全熔解。 The additive element Ga (purity: 4N) was adjusted to a composition ratio of a Ga concentration of 35 at%, and the raw material was completely melted in the same manner as in Example 1.

於原料完全熔解後,將氬氣導入腔室內部,將熔液溫度降低至910℃, 在熔液溫度穩定時,開始放液。放液方法、鑄模之尺寸與實施例1相同。 After the raw material is completely melted, argon gas is introduced into the chamber to reduce the temperature of the melt to 910 ° C. When the melt temperature is stable, the liquid discharge is started. The size of the liquid discharge method and the mold was the same as in the first embodiment.

對鑄造之圓筒型鑄件,以加壓力1500kg/cm2、溫度750℃、保持時間2小時之條件,實施HIP處理。存在鑄件之具有50μm以上之等圓直徑的細孔個數,每單位cm2為1.5個,HIP後之細孔個數,每單位cm2為0.2個,滿足0.3個/cm2以下。其結果示於表1。以與實施例1同樣條件進行濺鍍,結果異常放電數為2次。藉此,可達成本案之目的。其結果示於表1。 For the cast cylindrical casting, HIP treatment was carried out under the conditions of a pressing force of 1500 kg/cm 2 , a temperature of 750 ° C, and a holding time of 2 hours. There are the number of pores having a circular diameter of 50 μm or more in the casting, 1.5 per unit cm 2 , and the number of pores after HIP is 0.2 per unit cm 2 , which satisfies 0.3/cm 2 or less. The results are shown in Table 1. Sputtering was carried out under the same conditions as in Example 1. As a result, the number of abnormal discharges was two. Thereby, the purpose of the cost case can be reached. The results are shown in Table 1.

(比較例9) (Comparative Example 9)

對與實施例11同樣方式鑄造之圓筒型鑄件,以加壓力1500kg/cm2、溫度650℃、保持時間3小時之條件,實施HIP處理。存在鑄件之具有50μm以上之等圓直徑的細孔個數,每單位cm2為1.5個,HIP後之細孔個數,每單位cm2為0.6個。 The cylindrical casting cast in the same manner as in Example 11 was subjected to HIP treatment under the conditions of a pressing pressure of 1500 kg/cm 2 , a temperature of 650 ° C, and a holding time of 3 hours. There are the number of pores having a circular diameter of 50 μm or more in the casting, 1.5 per unit cm 2 , and the number of pores after HIP is 0.6 per unit cm 2 .

係以與實施例11不同之HIP條件(低溫)進行處理者,細孔數增加。其結果同樣示於表1。以與實施例1同樣條件進行濺鍍,結果異常放電數為40次,為異常放電多之結果。 When the treatment was carried out under the HIP condition (low temperature) different from that of Example 11, the number of pores was increased. The results are also shown in Table 1. Sputtering was carried out under the same conditions as in Example 1. As a result, the number of abnormal discharges was 40, which was a result of a large number of abnormal discharges.

(實施例12) (Embodiment 12)

對與實施例11同樣方式鑄造之圓筒型鑄件,以加壓力1500kg/cm2、溫度750℃、保持時間5小時之條件,實施HIP處理。存在鑄件之具有50μm以上之等圓直徑的細孔個數,每單位cm2為1.5個,HIP後之細孔個數,每單位cm2為0個,滿足0.3個/cm2以下。其結果示於表1。以與實施例1同樣條件進行濺鍍,結果異常放電數為0次。藉此,可達成本案之目的。其結果示於表1。 The cylindrical casting cast in the same manner as in Example 11 was subjected to HIP treatment under the conditions of a pressing pressure of 1500 kg/cm 2 , a temperature of 750 ° C, and a holding time of 5 hours. There are the number of pores having a circular diameter of 50 μm or more in the casting, 1.5 per unit cm 2 , and the number of pores after HIP is 0 per unit cm 2 , which satisfies 0.3/cm 2 or less. The results are shown in Table 1. Sputtering was carried out under the same conditions as in Example 1. As a result, the number of abnormal discharges was 0. Thereby, the purpose of the cost case can be reached. The results are shown in Table 1.

(實施例13) (Example 13)

除了使真空度為5×10-2torr以外,對與實施例11同樣方式鑄造之圓筒型鑄件,以加壓力1500kg/cm2、溫度750℃、保持時間3小時之條件,實施HIP處理。存在鑄件之具有50μm以上之等圓直徑的細孔個數,每單位cm2為3.3個,HIP後之細孔個數,每單位cm2為0.3個,滿足0.3個/cm2以下。其結果示於表1。以與實施例1同樣條件進行濺鍍,結果異常放電數為3次。藉此,可達成本案之目的。其結果示於表1。 The cylindrical casting cast in the same manner as in Example 11 was subjected to HIP treatment under the conditions of a pressing force of 1500 kg/cm 2 , a temperature of 750 ° C and a holding time of 3 hours, except that the degree of vacuum was 5 × 10 -2 torr. There is a number of pores having a circular diameter of 50 μm or more in the casting, 3.3 per unit cm 2 , and the number of pores after HIP is 0.3 per unit cm 2 , which satisfies 0.3/cm 2 or less. The results are shown in Table 1. Sputtering was carried out under the same conditions as in Example 1. As a result, the number of abnormal discharges was three. Thereby, the purpose of the cost case can be reached. The results are shown in Table 1.

(比較例10) (Comparative Example 10)

除了使真空度為5×10-1torr以外,對與實施例11同樣方式鑄造之圓筒型鑄件,以加壓力1500kg/cm2、溫度750℃、保持時間3小時之條件,實施HIP處理。存在鑄件之具有50μm以上之等圓直徑的細孔個數,每單位cm2為4.2個,HIP後之細孔個數,每單位cm2為0.4個。 The cylindrical casting cast in the same manner as in Example 11 was subjected to HIP treatment under the conditions of a pressing force of 1500 kg/cm 2 , a temperature of 750 ° C and a holding time of 3 hours, except that the degree of vacuum was 5 × 10 -1 torr. There is a number of pores having a circular diameter of 50 μm or more in the casting, 4.2 per unit cm 2 , and the number of pores after HIP is 0.4 per unit cm 2 .

係以與實施例11不同之真空度(低真空)進行處理者,細孔數增加。其結果同樣示於表1。以與實施例1同樣條件進行濺鍍,結果異常放電數為11次,為異常放電多之結果。 When the treatment was carried out under a vacuum (low vacuum) different from that of Example 11, the number of pores was increased. The results are also shown in Table 1. Sputtering was carried out under the same conditions as in Example 1. As a result, the number of abnormal discharges was 11 times, which resulted in a large number of abnormal discharges.

(實施例14) (Example 14)

除了使放液溫度為1040℃以外,對與實施例11同樣方式鑄造之圓筒型鑄件,以加壓力1500kg/cm2、溫度750℃、保持時間2小時之條件,實施HIP處理。存在鑄件之具有50μm以上之等圓直徑的細孔個數,每單位cm2為2.9個,HIP後之細孔個數,每單位cm2為0.1個,滿足0.3個/cm2以下。其結果示於表1。以與實施例1同樣條件進行濺鍍,結果異常放電數為2次。藉此,可達成本案之目的。其結果示於表1。 The cylindrical casting cast in the same manner as in Example 11 was subjected to HIP treatment under the conditions of a pressing force of 1500 kg/cm 2 , a temperature of 750 ° C and a holding time of 2 hours, except that the discharge temperature was 1040 ° C. The number of pores having a circular diameter of 50 μm or more in the casting is 2.9 per unit cm 2 , and the number of pores after HIP is 0.1 per unit cm 2 , which satisfies 0.3/cm 2 or less. The results are shown in Table 1. Sputtering was carried out under the same conditions as in Example 1. As a result, the number of abnormal discharges was two. Thereby, the purpose of the cost case can be reached. The results are shown in Table 1.

(比較例11) (Comparative Example 11)

對與實施例14同樣方式鑄造之圓筒型鑄件,以加壓力1500kg/cm2、溫度600℃、保持時間3小時之條件,實施HIP處理。存在鑄件之具有50μm以上之等圓直徑的細孔個數,每單位cm2為2.9個,HIP後之細孔個數,每單位cm2為1.0個。 The cylindrical casting cast in the same manner as in Example 14 was subjected to HIP treatment under the conditions of a pressing force of 1500 kg/cm 2 , a temperature of 600 ° C, and a holding time of 3 hours. There are the number of pores having a circular diameter of 50 μm or more in the casting, 2.9 per unit cm 2 , and the number of pores after HIP is 1.0 per unit cm 2 .

係以與實施例11不同之HIP條件(低溫)進行處理者,細孔數增加。其結果同樣示於表1。以與實施例1同樣條件進行濺鍍,結果異常放電數為72次,為異常放電多之結果。 When the treatment was carried out under the HIP condition (low temperature) different from that of Example 11, the number of pores was increased. The results are also shown in Table 1. Sputtering was carried out under the same conditions as in Example 1. As a result, the number of abnormal discharges was 72, which was a result of a large number of abnormal discharges.

(實施例15) (Example 15)

除了使真空度為5×10-4torr以外,對與實施例11同樣方式鑄造之圓筒型鑄件,以加壓力1500kg/cm2、溫度750℃、保持時間3小時之條件,實施HIP處理。存在鑄件之具有50μm以上之等圓直徑的細孔個數,每單位cm2為2.4個,HIP後之細孔個數,每單位cm2為0個,滿足0.3個/cm2以下。其結果示於表1。以與實施例1同樣條件進行濺鍍,結果異常放電數為1次。藉此,可達成本案之目的。其結果示於表1。 The cylindrical casting cast in the same manner as in Example 11 was subjected to a HIP treatment under the conditions of a pressing force of 1500 kg/cm 2 , a temperature of 750 ° C and a holding time of 3 hours, except that the degree of vacuum was 5 × 10 -4 torr. There are the number of pores having a circular diameter of 50 μm or more in the casting, 2.4 per unit cm 2 , and the number of pores after HIP is 0 per unit cm 2 , which satisfies 0.3/cm 2 or less. The results are shown in Table 1. Sputtering was carried out under the same conditions as in Example 1. As a result, the number of abnormal discharges was one. Thereby, the purpose of the cost case can be reached. The results are shown in Table 1.

(比較例12) (Comparative Example 12)

除了使真空度為5×10-1torr以外,對與實施例14同樣方式鑄造之圓筒型鑄件,以加壓力1500kg/cm2、溫度750℃、保持時間3小時之條件,實施HIP處理。存在鑄件之具有50μm以上之等圓直徑的細孔個數,每單位cm2為4.3個,HIP後之細孔個數,每單位cm2為0.5個。 The cylindrical casting cast in the same manner as in Example 14 was subjected to HIP treatment under the conditions of a pressing force of 1500 kg/cm 2 , a temperature of 750 ° C and a holding time of 3 hours, except that the degree of vacuum was 5 × 10 -1 torr. There are the number of pores having a circular diameter of 50 μm or more in the casting, 4.3 per unit cm 2 , and the number of pores after HIP is 0.5 per unit cm 2 .

係以與實施例14不同之真空度(低真空)進行處理者,細孔數增加。其結果同樣示於表1。以與實施例1同樣條件進行濺鍍,結果異常放電數為34次,為異常放電多之結果。 When the treatment was carried out under a vacuum (low vacuum) different from that of Example 14, the number of pores was increased. The results are also shown in Table 1. Sputtering was carried out under the same conditions as in Example 1. As a result, the number of abnormal discharges was 34, which was a result of a large number of abnormal discharges.

(實施例16) (Embodiment 16)

除了使放液溫度為1050℃以外,對與實施例11同樣方式鑄造之圓筒型鑄件,以加壓力1500kg/cm2、溫度750℃、保持時間6小時之條件,實施HIP處理。存在鑄件之具有50μm以上之等圓直徑的細孔個數,每單位cm2為3.1個,HIP後之細孔個數,每單位cm2為0.2個,滿足0.3個/cm2以下。其結果示於表1。以與實施例1同樣條件進行濺鍍,結果異常放電數為2次。藉此,可達成本案之目的。其結果示於表1。 The cylindrical casting cast in the same manner as in Example 11 was subjected to HIP treatment under the conditions of a pressing force of 1500 kg/cm 2 , a temperature of 750 ° C and a holding time of 6 hours, except that the discharge temperature was 1050 ° C. There are the number of pores having a circular diameter of 50 μm or more in the casting, 3.1 per unit cm 2 , and the number of pores after HIP is 0.2 per unit cm 2 , which satisfies 0.3/cm 2 or less. The results are shown in Table 1. Sputtering was carried out under the same conditions as in Example 1. As a result, the number of abnormal discharges was two. Thereby, the purpose of the cost case can be reached. The results are shown in Table 1.

(實施例17) (Example 17)

除了使放液溫度為1100℃以外,對與實施例11同樣方式鑄造之圓筒型鑄件,以加壓力1500kg/cm2、溫度750℃、保持時間3小時之條件,實施HIP處理。存在鑄件之具有50μm以上之等圓直徑的細孔個數,每單位cm2為3.5個,HIP後之細孔個數,每單位cm2為0.3個,滿足0.3個/cm2以下。其結果示於表1。以與實施例1同樣條件進行濺鍍,結果異常放電數為4次。藉此,可達成本案之目的。其結果示於表1。 The cylindrical casting cast in the same manner as in Example 11 was subjected to HIP treatment under the conditions of a pressing force of 1500 kg/cm 2 , a temperature of 750 ° C and a holding time of 3 hours, except that the discharge temperature was 1,100 ° C. There are the number of pores having a circular diameter of 50 μm or more in the casting, 3.5 per unit cm 2 , and the number of pores after HIP is 0.3 per unit cm 2 , which satisfies 0.3 pieces/cm 2 or less. The results are shown in Table 1. Sputtering was carried out under the same conditions as in Example 1. As a result, the number of abnormal discharges was four. Thereby, the purpose of the cost case can be reached. The results are shown in Table 1.

(比較例13) (Comparative Example 13)

除了使放液溫度為1200℃以外,對與實施例14同樣方式鑄造之圓筒型鑄件,以加壓力1500kg/cm2、溫度750℃、保持時間3小時之條件,實施HIP處理。存在鑄件之具有50μm以上之等圓直徑的細孔個數,每單位cm2為5.5個,HIP後之細孔個數,每單位cm2為1.2個。 The cylindrical casting cast in the same manner as in Example 14 was subjected to HIP treatment under the conditions of a pressing force of 1500 kg/cm 2 , a temperature of 750 ° C and a holding time of 3 hours, except that the discharge temperature was 1200 ° C. There are the number of pores having a circular diameter of 50 μm or more in the casting, 5.5 per unit cm 2 , and the number of pores after HIP is 1.2 per unit cm 2 .

係以與實施例14不同之放液溫度(高溫)進行處理者,細孔數增加。其結果同樣示於表1。以與實施例1同樣條件進行濺鍍,結果異常放電數為84次,為異常放電多之結果。 When the treatment was carried out at a discharge temperature (high temperature) different from that of Example 14, the number of pores was increased. The results are also shown in Table 1. Sputtering was carried out under the same conditions as in Example 1. As a result, the number of abnormal discharges was 84, which was a result of a large abnormal discharge.

[產業上之可利用性] [Industrial availability]

根據本發明,具有下述優異之效果:可提供一種即使是Ga濃度為25at%~35at%之範圍的CuGa合金,亦不會產生裂縫,且細孔(空孔或空隙)減少之靶。又,相較於燒結體靶,具有可減少氣體成分之大優點。如此,藉由使用具有氣體成分少且細孔發生少之鑄造組織的Cu-Ga合金靶進行濺鍍,而具有下述效果:可得到異常放電及顆粒之發生少、均質之Cu-Ga系合金膜,且可大幅降低Cu-Ga合金靶之製造成本。 According to the present invention, there is an excellent effect that a CuGa alloy having a Ga concentration of 25 at% to 35 at% can be provided without causing cracks and a target in which pores (voids or voids) are reduced. Moreover, compared with the sintered body target, it has the advantage of reducing the gas composition. In this way, sputtering is performed by using a Cu-Ga alloy target having a cast structure having a small gas component and a small number of pores, and the Cu-Ga alloy having a small amount of occurrence of abnormal discharge and generation of particles can be obtained. The film can greatly reduce the manufacturing cost of the Cu-Ga alloy target.

由於可用此種濺鍍膜製造光吸收層及CIGS系太陽電池,故適用於用以抑制CIGS太陽電池之轉換效率降低的太陽電池。 Since the light absorbing layer and the CIGS-based solar cell can be produced by using such a sputtering film, it is suitable for a solar cell for suppressing a decrease in conversion efficiency of a CIGS solar cell.

Claims (8)

一種Cu-Ga合金圓筒型鑄造品,係經熔解、鑄造之Cu-Ga合金的圓筒型鑄造品,該Cu-Ga合金之Ga在25at%以上35at%以下,剩餘部分由Cu及不可避免之雜質構成,其特徵在於:將該圓筒型鑄造品切割成輪狀切片時,橫剖面中具有100μm以上之等圓直徑的細孔其個數在3.5個/cm2以下。 A Cu-Ga alloy cylindrical casting product is a cylindrical casting of a melted and cast Cu-Ga alloy. The Ga of the Cu-Ga alloy is 25 at% or more and 35 at% or less, and the balance is Cu and inevitable. In the case of cutting the cylindrical cast product into a circular slice, the number of the pores having a circular diameter of 100 μm or more in the cross section is 3.5 pieces/cm 2 or less. 一種Cu-Ga合金圓筒型鑄造品之製造方法,係對Cu-Ga合金進行熔解、鑄造,製造圓筒型鑄造品之方法,該Cu-Ga合金之Ga在25at%以上35at%以下,剩餘部分由Cu及不可避免之雜質構成,其特徵在於:使熔解溫度為該合金之(熔點+100)℃以上1100℃以下,且使真空度為5.0×10-2torr以上之高真空度,進行熔解、鑄造。 A method for producing a Cu-Ga alloy cylindrical casting product, which is a method for melting and casting a Cu-Ga alloy to produce a cylindrical casting product, wherein the Ga of the Cu-Ga alloy is 25 at% or more and 35 at% or less, and the remaining Partly composed of Cu and unavoidable impurities, the melting temperature is set to (the melting point +100) ° C or more and 1100 ° C or less, and the degree of vacuum is 5.0 × 10 -2 torr or more. Melting and casting. 如申請專利範圍第2項之Cu-Ga合金圓筒型鑄造品之製造方法,其係使熔解溫度為該合金之(熔點+100)℃以上1040℃以下。 The method for producing a Cu-Ga alloy cylindrical cast product according to the second aspect of the patent application is characterized in that the melting temperature is (melting point + 100) ° C or more and 1040 ° C or less of the alloy. 如申請專利範圍第2或3項之Cu-Ga合金圓筒型鑄造品之製造方法,其中,藉由該製造方法,當將圓筒型鑄造品切割成輪狀切片之情形時,使橫剖面中具有100μm以上之等圓直徑的細孔個數在3.5個/cm2以下。 The method for producing a Cu-Ga alloy cylindrical casting according to the second or third aspect of the patent application, wherein the cross-section is made when the cylindrical casting is cut into a circular section by the manufacturing method The number of pores having an equi-circle diameter of 100 μm or more is 3.5/cm 2 or less. 一種Cu-Ga合金圓筒型濺鍍靶,係Ga在25at%以上35at%以下,剩餘部分由Cu及不可避免之雜質構成的Cu-Ga合金濺鍍靶,其特徵在於:該靶中具有50μm以上之等圓直徑的細孔之個數在0.3個/cm2以下。 A Cu-Ga alloy cylindrical sputtering target is a Cu-Ga alloy sputtering target in which Ga is 25 at% or more and 35 at% or less, and the balance is composed of Cu and unavoidable impurities, and the target has 50 μm. The number of the fine holes having the above-mentioned equal-diameter diameter is 0.3 pieces/cm 2 or less. 一種Cu-Ga合金圓筒型濺鍍靶之製造方法,係製造Cu-Ga合金濺鍍靶之方法,該Cu-Ga合金之Ga在25at%以上35at%以下,剩餘部分由Cu及不可避免之雜質構成,其特徵在於:當熔解Cu-Ga合金原料時,使 熔解溫度為該合金之(熔點+100)℃以上1100℃以下,且使真空度為5.0×10-2torr以上之高真空度,進行熔解、鑄造,製成Cu-Ga合金圓筒型鑄造品後,以加壓力1500kg/cm2以上、溫度750℃以上(熔點-50)℃以下、保持時間2小時以上的條件,對該Cu-Ga合金圓筒型鑄造品進行HIP處理,進一步加工成靶形狀。 A method for manufacturing a Cu-Ga alloy cylindrical sputtering target, which is a method for manufacturing a Cu-Ga alloy sputtering target, wherein the Ga of the Cu-Ga alloy is 25 at% or more and 35 at% or less, and the balance is Cu and inevitable The impurity composition is characterized in that when the Cu-Ga alloy raw material is melted, the melting temperature is set to a high degree of vacuum of the alloy (melting point + 100) ° C or more and 1100 ° C or less, and the degree of vacuum is 5.0 × 10 -2 torr or more. After melting and casting, a Cu-Ga alloy cylindrical casting product is produced, and the pressure is 1500 kg/cm 2 or more, the temperature is 750 ° C or higher (melting point - 50) ° C or lower, and the holding time is 2 hours or longer. The Cu-Ga alloy cylindrical cast product is subjected to HIP treatment and further processed into a target shape. 如申請專利範圍第6項之Cu-Ga合金圓筒型濺鍍靶之製造方法,其中,使該熔解溫度為該合金(熔點+100)℃以上1040℃以下,且使真空度為5.0×10-3torr以上之高真空度,進行熔解、鑄造,製成Cu-Ga合金圓筒型鑄造品後,以加壓力1500kg/cm2以上、溫度750℃以上(熔點-50)℃以下、保持時間3小時以上的條件,對該Cu-Ga合金圓筒型鑄造品進行HIP處理。 The method for producing a Cu-Ga alloy cylindrical sputtering target according to the sixth aspect of the invention, wherein the melting temperature is the alloy (melting point + 100) ° C or more and 1040 ° C or less, and the degree of vacuum is 5.0 × 10 -3 torr or higher vacuum degree, melting and casting, after forming a Cu-Ga alloy cylindrical casting, the pressing pressure is 1500kg/cm 2 or more, the temperature is 750 ° C or higher (melting point - 50) ° C or less, and the holding time is The Cu-Ga alloy cylindrical cast product was subjected to HIP treatment under conditions of 3 hours or longer. 如申請專利範圍第7項之Cu-Ga合金圓筒型濺鍍靶之製造方法,其中,藉由該步驟,使具有50μm以上之等圓直徑的細孔個數在0.3個/cm2以下。 The method for producing a Cu-Ga alloy cylindrical sputtering target according to the seventh aspect of the invention, wherein the number of pores having an equilateral diameter of 50 μm or more is 0.3/cm 2 or less.
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