TW201441818A - Flash memory device capable of regulating temperature - Google Patents

Flash memory device capable of regulating temperature Download PDF

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Publication number
TW201441818A
TW201441818A TW102113538A TW102113538A TW201441818A TW 201441818 A TW201441818 A TW 201441818A TW 102113538 A TW102113538 A TW 102113538A TW 102113538 A TW102113538 A TW 102113538A TW 201441818 A TW201441818 A TW 201441818A
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Taiwan
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flash memory
memory device
control module
temperature
switch module
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TW102113538A
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Chinese (zh)
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Jin-Zhong Guo
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Innodisk Corp
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Priority to TW102113538A priority Critical patent/TW201441818A/en
Publication of TW201441818A publication Critical patent/TW201441818A/en

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Abstract

The invention provides a Flash memory device capable of regulating temperature, including a temperature sensor, a switch module, at least a flash memory element, and a control module wherein the temperature sensor is used for sensing environment temperature. When environment temperature is lower than a floor temperature value or higher than a ceiling temperature value, the control module controls the conduction of the switch module so that an operational power supplier supplies power to a heating fin or a cooling plate through the switch module. The environment temperature of the flash memory device is regulated by heating or cooling the heating fin or the cooling plate, increasing the accuracy of data reading for the flash memory device or avoiding possibility of high temperature damage for device elements from being destroyed by high temperature.

Description

可調整溫度之快閃記憶體裝置Adjustable temperature flash memory device

  本發明有關於一種可調整溫度之快閃記憶體裝置,將用以調整快閃記憶體裝置的環境溫度。
The invention relates to a temperature-adjustable flash memory device for adjusting the ambient temperature of a flash memory device.

  半導體製程技術的快速發展,使得快閃記憶體裝置之記憶容量相對地提升,而逐漸廣泛地使用在資料備份上。The rapid development of semiconductor process technology has made the memory capacity of flash memory devices relatively higher, and has been widely used in data backup.

  對於快閃記憶體裝置而言,溫度的變化常會影響到資料讀取上之問題。舉例來說,快閃記憶體裝置操作在一臨界溫度以下(例如:0℃),資料讀取錯誤的情況也會相對地增加,以致容易讀到較多的錯誤資料。在此,為了從極端溫度下的快閃記憶體裝置中讀取到正確的資料,以往只能利用錯誤更正碼(Error correction codes;ECC)來確保資料的正確性,如此做法必須相對增加ECC碼之長度,這對於快閃記憶體裝置的製作成本而言甚為不利。
For flash memory devices, temperature changes often affect the reading of data. For example, if the flash memory device operates below a critical temperature (eg, 0 ° C), the data read error will increase relatively, making it easier to read more erroneous data. Here, in order to read the correct data from the flash memory device at extreme temperatures, the error correction codes (ECC) can only be used to ensure the correctness of the data. Therefore, the ECC code must be relatively increased. The length, which is very disadvantageous for the production cost of the flash memory device.

  本發明之一目的,在於提供一種可調整溫度之快閃記憶體裝置,其裝置之中提供一溫度感測器及一加熱片,當溫度感測器偵測環境溫度低於一下限溫度值時,快閃記憶體裝置將以一週期性之脈波訊號或以一單一準位訊號控制加熱片加熱,以使環境溫度升溫,避免快閃記憶體裝置運作在低溫的環境下容易造成裝置元件損毀或加速老化並確保在低溫環境下資料讀寫的正確性。An object of the present invention is to provide a temperature-adjustable flash memory device, wherein a temperature sensor and a heater chip are provided in the device, when the temperature sensor detects that the ambient temperature is lower than a lower limit temperature value. The flash memory device will control the heating sheet with a periodic pulse signal or a single level signal to heat the ambient temperature, and prevent the flash memory device from operating in a low temperature environment, which may cause damage to the device components. Or accelerate aging and ensure the correct reading and writing of data in low temperature environments.

  本發明之一目的,在於提供一種可調整溫度之快閃記憶體裝置,其裝置之中提供一溫度感測器及一致冷片,當溫度感測器偵測環境溫度高於一上限溫度值時,快閃記憶體裝置將以一週期性之脈波訊號或以一單一準位訊號控制致冷片冷卻,以使環境溫度降溫,避免快閃記憶體裝置運作在高溫的環境下容易造成裝置元件損毀或加速老化並確保在高溫環境下資料讀寫的正確性。為了達到上述之目的,本發明提供一種可調整溫度之快閃記憶體裝置,包括:一溫度感測器,用以感測環境溫度;一加熱片,設置於至少一快閃記憶體元件之上;一開關模組,設置在一工作電源與加熱片之間;及一控制模組,連接溫度感測器及開關模組,當環境溫度低於一第一下限溫度值時,控制模組控制開關模組導通,以使工作電源經由開關模組供電至加熱片。An object of the present invention is to provide a temperature-adjustable flash memory device, wherein a temperature sensor and a uniform cold chip are provided in the device, when the temperature sensor detects that the ambient temperature is higher than an upper limit temperature value. The flash memory device will control the cooling of the cooling plate by a periodic pulse signal or by a single level signal to cool the ambient temperature, and avoid the operation of the flash memory device in a high temperature environment. Damage or accelerate aging and ensure correct reading and writing of data in high temperature environments. In order to achieve the above object, the present invention provides a temperature-adjustable flash memory device comprising: a temperature sensor for sensing an ambient temperature; and a heater chip disposed on at least one of the flash memory components a switch module disposed between a working power supply and a heating sheet; and a control module connected to the temperature sensor and the switch module, wherein the control module controls when the ambient temperature is lower than a first lower limit temperature value The switch module is turned on to supply the working power to the heater chip via the switch module.

  本發明一實施例中,當環境溫度高於一第二下限溫度值時,控制模組控制開關模組關閉,以使工作電源停止供電至加熱片。In an embodiment of the invention, when the ambient temperature is higher than a second lower limit temperature value, the control module controls the switch module to be turned off, so that the working power supply stops supplying power to the heating sheet.

  本發明一實施例中,第二下限溫度值將設定高於第一下限溫度值。In an embodiment of the invention, the second lower limit temperature value is set to be higher than the first lower limit temperature value.

  本發明又提供一種可調整溫度之快閃記憶體裝置,包括:一溫度感測器,用以感測環境溫度;一致冷片,設置於至少一快閃記憶體元件之上;一開關模組,設置在一工作電源與致冷片之間;及一控制模組,連接溫度感測器及開關模組,當環境溫度高於一第一上限溫度值時,控制模組控制開關模組導通,以使工作電源經由開關模組供電至致冷片。The invention further provides a temperature-adjustable flash memory device, comprising: a temperature sensor for sensing an ambient temperature; a uniform cold chip disposed on at least one of the flash memory components; and a switch module And a control module is connected between the temperature sensor and the switch module. When the ambient temperature is higher than a first upper limit temperature, the control module controls the switch module to be turned on. So that the working power is supplied to the cooling piece via the switch module.

  本發明一實施例中,當環境溫度低於一第二上限溫度值時,控制模組控制開關模組關閉,以使工作電源停止供電至致冷片。In an embodiment of the invention, when the ambient temperature is lower than a second upper limit temperature value, the control module controls the switch module to be turned off, so that the working power supply stops supplying power to the cooling plate.

  本發明一實施例中,第二上限溫度值將設定低於第一上限溫度值。In an embodiment of the invention, the second upper limit temperature value is set to be lower than the first upper limit temperature value.

  本發明一實施例中,控制模組為一微控制器或一控制電路。In an embodiment of the invention, the control module is a microcontroller or a control circuit.

  本發明一實施例中,致冷片設置於快閃記憶體裝置所有的元件之上。In one embodiment of the invention, the cooling fins are disposed over all of the components of the flash memory device.

  本發明一實施例中,控制模組利用一週期性之脈波訊號或一單一準位之電壓訊號控制開關模組之導通或關閉。
In an embodiment of the invention, the control module controls the on or off of the switch module by using a periodic pulse signal or a single level voltage signal.

100...快閃記憶體裝置100. . . Flash memory device

101...快閃記憶體裝置101. . . Flash memory device

102...快閃記憶體裝置102. . . Flash memory device

103...快閃記憶體裝置103. . . Flash memory device

10...脈波訊號10. . . Pulse signal

11...控制模組11. . . Control module

111...第一下限溫度值111. . . First lower limit temperature value

112...第二下限溫度值112. . . Second lower limit temperature value

113...第一上限溫度值113. . . First upper limit temperature value

114...第二上限溫度值114. . . Second upper limit temperature value

12...溫度感測器12. . . Temperature sensor

130...開關模組130. . . Switch module

131...開關模組131. . . Switch module

1310...電晶體開關元件1310. . . Transistor switching element

1311...電阻器1311. . . Resistor

1312...電容器1312. . . Capacitor

1313...第一節點1313. . . First node

15...加熱片15. . . Heating sheet

16...致冷片16. . . Cooling film

17...快閃記憶體元件17. . . Flash memory component

第1圖:本發明快閃記憶體裝置一較佳實施例之結構示意圖。
第2圖:本發明快閃記憶體裝置又一實施例之結構示意圖。
第3圖:本發明快閃記憶體裝置又一實施例之結構示意圖。
第4圖:本發明快閃記憶體裝置又一實施例之結構示意圖。
Figure 1 is a block diagram showing a preferred embodiment of a flash memory device of the present invention.
Fig. 2 is a schematic view showing the structure of still another embodiment of the flash memory device of the present invention.
Figure 3 is a block diagram showing another embodiment of the flash memory device of the present invention.
Figure 4 is a block diagram showing another embodiment of the flash memory device of the present invention.

  請參閱第1圖,為本發明快閃記憶體裝置一較佳實施例之結構示意圖。如圖所示,快閃記憶體裝置100包括一控制模組11、一溫度感測器12、一開關模組130、一加熱片15及複數個快閃記憶體元件17。Please refer to FIG. 1 , which is a schematic structural diagram of a flash memory device according to a preferred embodiment of the present invention. As shown, the flash memory device 100 includes a control module 11, a temperature sensor 12, a switch module 130, a heater chip 15, and a plurality of flash memory components 17.

  其中,本發明一實施例之開關模組130可為一電晶體開關元件,例如:BJT或MOS電晶體,其輸入端(如集極端)連接一工作電源(VCC),控制端(如基極端)連接控制模組11,輸出端(如射極端)連接加熱片15。控制模組11用以接收一脈波訊號10,其一端連接開關模組130,另一端連接溫度感測器12。加熱片15設置於快閃記憶體元件17之上或設置於快閃記憶體裝置100所有元件之上。The switch module 130 according to an embodiment of the present invention may be a transistor switching component, such as a BJT or MOS transistor, and an input terminal (such as a collector terminal) is connected to a working power supply (VCC), and the control terminal (such as a base terminal) The control module 11 is connected, and the output end (such as the emitter end) is connected to the heating piece 15. The control module 11 is configured to receive a pulse signal 10, one end of which is connected to the switch module 130, and the other end of which is connected to the temperature sensor 12. The heater chip 15 is disposed on the flash memory component 17 or disposed on all components of the flash memory device 100.

  本實施例中,控制模組11設定有一第一下限溫度值111(例如:0℃),並且控制模組11將透過溫度感測器12感測環境溫度。當溫度感測器12感測出環境溫度低於第一下限溫度值111時,控制模組11直接利用一定頻率的週期性脈波訊號10控制開關模組130的導通與否。接著,工作電源(VCC)經由導通的開關模組130供電至加熱片15,以使得加熱片15開始工作。工作中的加熱片15將會對於環境進行加熱,以使環境溫度可以升溫。而後,快閃記憶體裝置100將可以避免運作在一低溫的環境下,以降低資料讀取錯誤的機率。In this embodiment, the control module 11 is configured with a first lower limit temperature value 111 (for example, 0 ° C), and the control module 11 will sense the ambient temperature through the temperature sensor 12 . When the temperature sensor 12 senses that the ambient temperature is lower than the first lower limit temperature value 111, the control module 11 directly controls whether the switch module 130 is turned on or off by using the periodic pulse wave signal 10 of a certain frequency. Next, the operating power supply (VCC) is supplied to the heater chip 15 via the turned-on switch module 130 to cause the heater chip 15 to start operating. The heating sheet 15 in operation will heat the environment so that the ambient temperature can be raised. Then, the flash memory device 100 will be able to avoid operating in a low temperature environment to reduce the probability of data reading errors.

  本實施例中,控制模組11尚設定有一第二下限溫度值112(例如:30℃),第二下限溫度值112將設定高於第一下限溫度值111。當加熱片15加熱升溫而令環境溫度超過第二下限溫度值112時,控制模組11控制開關模組130進行關閉,則工作電源(VCC)將無法供電至加熱片15,以使加熱片15停止加熱的動作。In this embodiment, the control module 11 is further configured with a second lower limit temperature value 112 (eg, 30 ° C), and the second lower limit temperature value 112 is set to be higher than the first lower limit temperature value 111. When the heating sheet 15 is heated and raised to make the ambient temperature exceed the second lower limit temperature value 112, the control module 11 controls the switch module 130 to be turned off, and the operating power source (VCC) will not be able to supply power to the heating sheet 15 to make the heating sheet 15 Stop the heating action.

  請參閱第2圖,為本發明快閃記憶體裝置又一實施例之結構示意圖。如圖所示,本實施例快閃記憶體裝置101之開關模組131可為一開關電路,其包括一電晶體開關元件1310、一電阻器1311及一電容器1312。電晶體開關元件1310之輸入端連接工作電壓(VCC),輸出端連接加熱片15,控制端與電阻器1311之一端及電容器1312之一端共連接於一第一節點1313之上,電阻器1311之另一端連接控制模組11,第一節點1313將產生一電壓訊號V1。Please refer to FIG. 2 , which is a structural diagram of still another embodiment of the flash memory device of the present invention. As shown in the figure, the switch module 131 of the flash memory device 101 of the present embodiment can be a switch circuit including a transistor switching element 1310, a resistor 1311 and a capacitor 1312. The input end of the transistor switching element 1310 is connected to the working voltage (VCC), and the output end is connected to the heating piece 15. The control end is connected to one end of the resistor 1311 and one end of the capacitor 1312 to a first node 1313. The resistor 1311 The other end is connected to the control module 11, and the first node 1313 will generate a voltage signal V1.

  本發明一實施例中,控制模組11透過溫度感測器12感測環境的溫度變化,根據此溫度變化選擇利用一脈波密度調變方式(Pulse Density Modulation;PDM)調變脈波訊號10的脈波密度(亦即改變脈波的頻率),進而使得電壓訊號V1的準位可以跟隨著脈波密度的調變而相對地進行調整。In an embodiment of the invention, the control module 11 senses the temperature change of the environment through the temperature sensor 12, and selects a Pulse Density Modulation (PDM) modulation pulse signal 10 according to the temperature change. The pulse wave density (that is, the frequency of the pulse wave is changed), so that the level of the voltage signal V1 can be relatively adjusted following the modulation of the pulse wave density.

  舉例來說,控制模組11透過溫度感測器12感測到環境溫度處在較低的狀況時,將會相對調變出一頻率較高的脈波訊號10。此頻率較高的脈波訊號10將可以在第一節點1313上產生一較高準位的直流電壓訊號V1。之後,利用較高準位的直流電壓訊號V1驅動電晶體開關元件1310進行導通,則加熱片15將可以提供一較高的運作溫度以對於環境溫度進行加熱。反之,控制模組11透過溫度感測器12感測到環境溫度處在較高的狀況時,將會調變出一頻率較低的脈波訊號10。此頻率較低的脈波訊號10將可以在第一節點1313上產生一較低準位的直流電壓訊號V1。之後,此較低準位的直流電壓訊號V1亦可能無法驅動電晶體開關元件1310進行導通,而令加熱片15停止加熱的動作。For example, when the temperature sensor 12 senses that the ambient temperature is at a lower condition, the control module 11 will relatively modulate a higher frequency pulse signal 10. The higher frequency pulse signal 10 will generate a higher level DC voltage signal V1 on the first node 1313. Thereafter, using the higher level DC voltage signal V1 to drive the transistor switching element 1310 to conduct, the heater chip 15 will provide a higher operating temperature to heat the ambient temperature. Conversely, when the temperature sensor 12 senses that the ambient temperature is at a higher condition, the control module 11 will modulate a lower frequency pulse signal 10. The lower frequency pulse signal 10 will generate a lower level DC voltage signal V1 on the first node 1313. Thereafter, the lower-level DC voltage signal V1 may not be able to drive the transistor switching element 1310 to conduct, and the heating sheet 15 may stop heating.

  或者,本發明又一實施例中,控制模組11透過溫度感測器12感測環境的溫度變化,根據此溫度變化選擇利用一脈波寬度調變方式(Pulse Width Modulation;PWM)調變脈波訊號10的脈波寬度(亦即改變脈波的工作週期(Duty Cycle)),進而使得電壓訊號V1的準位可以跟隨著脈波寬度的調變而相對地進行調整。Alternatively, in another embodiment of the present invention, the control module 11 senses the temperature change of the environment through the temperature sensor 12, and selects a Pulse Width Modulation (PWM) modulation pulse according to the temperature change. The pulse width of the wave signal 10 (that is, the duty cycle of the pulse wave is changed), so that the level of the voltage signal V1 can be relatively adjusted following the modulation of the pulse width.

  舉例來說,控制模組11透過溫度感測器12感測到環境溫度處在較低的狀況時,將會相對調變出一具有較寬廣工作週期(例如:延長工作週期(Duty Cycle)的操作時間)的脈波訊號10。此較寬廣工作週期的脈波訊號10將可以在第一節點1313上產生一較高準位的直流電壓訊號V1。之後,利用較高準位的直流電壓訊號V1驅動電晶體開關元件1310進行導通,則加熱片15將可以提供一較高的運作溫度以對於環境溫度進行加熱。反之,控制模組11透過溫度感測器12感測到環境溫度處在較高的狀況時,將會調變出一具有較窄工作週期的的脈波訊號10。此頻率較低的脈波訊號10將可以在第一節點1313上產生一較低準位的直流電壓訊號V1。之後,此較低準位的直流電壓訊號V1亦可能無法驅動電晶體開關元件1310進行導通,而令加熱片15停止加熱的動作。For example, when the temperature sensor 12 senses that the ambient temperature is at a lower condition, the control module 11 will be relatively modified to have a wider duty cycle (for example, a Duty Cycle). Pulse time signal 10 of operation time). The pulse signal 10 of the wider duty cycle will generate a higher level DC voltage signal V1 on the first node 1313. Thereafter, using the higher level DC voltage signal V1 to drive the transistor switching element 1310 to conduct, the heater chip 15 will provide a higher operating temperature to heat the ambient temperature. Conversely, when the temperature sensor 12 senses that the ambient temperature is at a higher condition, the control module 11 will modulate a pulse signal 10 having a narrow duty cycle. The lower frequency pulse signal 10 will generate a lower level DC voltage signal V1 on the first node 1313. Thereafter, the lower-level DC voltage signal V1 may not be able to drive the transistor switching element 1310 to conduct, and the heating sheet 15 may stop heating.

  如上方式據以實施,當環境處在一較低溫的情況下,快閃記憶體裝置100/101將可以控制加熱片15進行加熱程序,以使環境溫度進行升溫,避免快閃記憶體裝置100/101運作在低溫的環境下容易造成裝置元件損毀或加速老化並確保在低溫環境下資料讀寫的正確性。According to the above method, when the environment is at a relatively low temperature, the flash memory device 100/101 can control the heating sheet 15 to perform a heating process to raise the ambient temperature to avoid the flash memory device 100/ The operation of 101 in a low temperature environment is likely to cause damage or accelerated aging of the device components and ensure correct reading and writing of data in a low temperature environment.

  請參閱第3圖,為本發明快閃記憶體裝置又一實施例之結構示意圖。如圖所示,本實施例快閃記憶體裝置102之電路結構相似於上述實施例之快閃記憶體裝置100,兩者差異性僅在於上述實施例快閃記憶體裝置100之中設置有一加熱片15且利用加熱片152對於一低溫的環境進行一加熱程序,而本實施例快閃記憶體裝置102之中設置有一致冷片16且利用致冷片16對於一高溫的環境進行一冷卻程序。Please refer to FIG. 3 , which is a schematic structural diagram of still another embodiment of the flash memory device of the present invention. As shown in the figure, the circuit structure of the flash memory device 102 of the present embodiment is similar to that of the flash memory device 100 of the above embodiment, and the difference between the two is only that a heating is provided in the flash memory device 100 of the above embodiment. The sheet 15 is heated by a heating sheet 152 for a low temperature environment. In the flash memory device 102 of the present embodiment, a uniform cold sheet 16 is disposed, and the cooling sheet 16 is used to perform a cooling process for a high temperature environment. .

  在本實施例中,開關模組130之輸出端將連接一致冷片16,致冷片16設置於快閃記憶體元件17之上或進一步設置於快閃記憶體裝置102所有的元件之上。並且,控制模組11設定有一第一上限溫度值113(例如:90℃)。In this embodiment, the output end of the switch module 130 is connected to the uniform cold plate 16, and the cooling plate 16 is disposed on the flash memory component 17 or further disposed on all components of the flash memory device 102. Moreover, the control module 11 is set to have a first upper limit temperature value 113 (for example, 90 ° C).

  當溫度感測器12感測環境溫度高於第一上限溫度值113時,控制模組11直接利用一定頻率的週期性脈波訊號10控制開關模組130的導通與否。接著,工作電源(VCC)經由導通的開關模組130供電至致冷片16,以使得致冷片16開始工作。工作中的致冷片16將會對於環境進行冷卻,以使環境溫度可以降溫,如此以避免快閃記憶體裝置102運作在高溫的環境下容易造成裝置元件損毀的情況或資料讀取錯誤的機率。When the temperature sensor 12 senses that the ambient temperature is higher than the first upper limit temperature value 113, the control module 11 directly controls whether the switch module 130 is turned on or off by using the periodic pulse wave signal 10 of a certain frequency. Next, the operating power supply (VCC) is supplied to the cooling fins 16 via the turned-on switching module 130 to cause the cooling fins 16 to start operating. The working cooling fins 16 will cool the environment so that the ambient temperature can be lowered, so as to avoid the possibility that the flash memory device 102 operates in a high temperature environment, which may cause damage to the device components or the probability of data reading errors. .

  本實施例中,控制模組11尚設定有一第二上限溫度值114(例如:50℃),第二上限溫度值114將設定低於第一上限溫度值113。當致冷片16冷卻降溫而令環境溫度低於第二上限溫度值114時,控制模組11控制開關模組130進行關閉,則工作電源(VCC)將無法供電至致冷片16,以使致冷片16停止冷卻的動作。In this embodiment, the control module 11 is further configured with a second upper limit temperature value 114 (for example, 50 ° C), and the second upper limit temperature value 114 is set lower than the first upper limit temperature value 113. When the cooling plate 16 is cooled and cooled to make the ambient temperature lower than the second upper limit temperature value 114, the control module 11 controls the switch module 130 to be turned off, and the operating power supply (VCC) will not be able to supply power to the cooling fins 16 so that The action of the cooling sheet 16 to stop cooling.

  請參閱第4圖,為本發明快閃記憶體裝置又一實施例之結構示意圖。如圖所示,本實施例快閃記憶體裝置103之開關模組131可為一開關電路,其包括一電晶體開關元件1310、一電阻器1311及一電容器1312。電晶體開關元件1310之輸入端連接工作電壓(VCC),輸出端連接致冷片16,控制端與電阻器1311之一端及電容器1312之一端共連接於一第一節點1313之上,電阻器1311之另一端連接控制模組11,第一節點1313將產生一電壓訊號V1。Please refer to FIG. 4 , which is a structural diagram of still another embodiment of the flash memory device of the present invention. As shown in the figure, the switch module 131 of the flash memory device 103 of the present embodiment can be a switch circuit including a transistor switching element 1310, a resistor 1311 and a capacitor 1312. The input end of the transistor switching element 1310 is connected to the working voltage (VCC), the output end is connected to the cooling fin 16, and the control end is connected to one end of the resistor 1311 and one end of the capacitor 1312 to a first node 1313. The resistor 1311 The other end is connected to the control module 11, and the first node 1313 will generate a voltage signal V1.

  本發明一實施例中,控制模組11透過溫度感測器12感測環境的溫度變化,根據此溫度變化選擇利用一脈波密度調變方式(Pulse Density Modulation;PDM)調變脈波訊號10的脈波密度(亦即改變脈波的頻率),進而使得電壓訊號V1的準位可以跟隨著脈波密度的調變而相對地進行調整。In an embodiment of the invention, the control module 11 senses the temperature change of the environment through the temperature sensor 12, and selects a Pulse Density Modulation (PDM) modulation pulse signal 10 according to the temperature change. The pulse wave density (that is, the frequency of the pulse wave is changed), so that the level of the voltage signal V1 can be relatively adjusted following the modulation of the pulse wave density.

  舉例來說,控制模組11透過溫度感測器12感測到環境溫度處在較高的狀況時,將會相對調變出一頻率較高的脈波訊號10。此頻率較高的脈波訊號10將可以在第一節點1313上產生一較高準位的直流電壓訊號V1。之後,利用較高準位的直流電壓訊號V1驅動電晶體開關元件1310進行導通,致冷片16將可以提供一較低的運作溫度以對於環境溫度進行降溫。反之,控制模組11透過溫度感測器12感測到環境溫度處在較高的狀況時,將會調變出一頻率較低的脈波訊號10。此頻率較低的脈波訊號10將可以在第一節點1313上產生一較低準位的直流電壓訊號V1。之後,此較低準位的直流電壓訊號V1亦可能無法驅動電晶體開關元件1310進行導通,而令致冷片16停止冷卻的動作。For example, when the temperature sensor 12 senses that the ambient temperature is at a higher condition, the control module 11 will relatively modulate a pulse signal 10 having a higher frequency. The higher frequency pulse signal 10 will generate a higher level DC voltage signal V1 on the first node 1313. Thereafter, the transistor switching element 1310 is driven to conduct using the higher level DC voltage signal V1, and the fins 16 will provide a lower operating temperature to cool the ambient temperature. Conversely, when the temperature sensor 12 senses that the ambient temperature is at a higher condition, the control module 11 will modulate a lower frequency pulse signal 10. The lower frequency pulse signal 10 will generate a lower level DC voltage signal V1 on the first node 1313. Thereafter, the DC voltage signal V1 of the lower level may not be able to drive the transistor switching element 1310 to conduct, and the cooling sheet 16 stops the cooling operation.

  或者,本發明又一實施例中,控制模組11透過溫度感測器12感測環境的溫度變化,根據此溫度變化選擇利用一脈波寬度調變方式(Pulse Width Modulation;PWM)調變脈波訊號10的脈波寬度(亦即改變脈波的工作週期(Duty Cycle)),進而使得電壓訊號V1的準位可以跟隨著脈波寬度的調變而相對地進行調整。Alternatively, in another embodiment of the present invention, the control module 11 senses the temperature change of the environment through the temperature sensor 12, and selects a Pulse Width Modulation (PWM) modulation pulse according to the temperature change. The pulse width of the wave signal 10 (that is, the duty cycle of the pulse wave is changed), so that the level of the voltage signal V1 can be relatively adjusted following the modulation of the pulse width.

  舉例來說,控制模組11透過溫度感測器12感測到環境溫度處在較高的狀況時,將會調變出一具有較寬廣工作週期的脈波訊號10。此較寬廣工作週期的脈波訊號10將可以在第一節點1313上產生一較高準位的直流電壓訊號V1。之後,利用較高準位的直流電壓訊號V1驅動電晶體開關元件1310進行導通,加熱片15將可以提供一較高的運作溫度以對於環境溫度進行加熱。反之,控制模組11透過溫度感測器12感測到環境溫度處在較高的狀況時,將會調變出一具有較窄工作週期的的脈波訊號10。此頻率較低的脈波訊號10將可以在第一節點1313上產生一較低準位的直流電壓訊號V1。之後,此較低準位的直流電壓訊號V1亦可能無法驅動電晶體開關元件1310進行導通,而令加熱片15停止加熱的動作。For example, when the temperature sensor 12 senses that the ambient temperature is at a higher condition, the control module 11 will modulate a pulse signal 10 having a wider duty cycle. The pulse signal 10 of the wider duty cycle will generate a higher level DC voltage signal V1 on the first node 1313. Thereafter, the transistor switching element 1310 is driven to conduct with a higher level of the DC voltage signal V1, and the heater chip 15 will provide a higher operating temperature to heat the ambient temperature. Conversely, when the temperature sensor 12 senses that the ambient temperature is at a higher condition, the control module 11 will modulate a pulse signal 10 having a narrow duty cycle. The lower frequency pulse signal 10 will generate a lower level DC voltage signal V1 on the first node 1313. Thereafter, the lower-level DC voltage signal V1 may not be able to drive the transistor switching element 1310 to conduct, and the heating sheet 15 may stop heating.

  如上方式據以實施,當環境處在一較高溫的情況下,快閃記憶體裝置102/103將可以控制致冷片16進行冷卻程序,以使環境溫度進行降溫,避免快閃記憶體裝置102/103運作在高溫的環境下容易造成裝置元件損毀或加速老化並確保在高溫環境下資料讀寫的正確性。As described above, when the environment is at a relatively high temperature, the flash memory device 102/103 can control the cooling sheet 16 to perform a cooling process to cool the ambient temperature to avoid the flash memory device 102. /103 Operating in a high temperature environment is likely to cause damage or accelerated aging of the device components and ensure correct reading and writing of data in high temperature environments.

  承上所述,本發明之加熱片15與致冷片16為一單獨元件分別設置在各對應的快閃記憶體裝置100、101、102、103之中。然,實際應用設計時,亦可選擇將加熱片15與致冷片16組成一組合元件,並設置在單一快閃記憶體裝置100/101/102/103之中,以令快閃記憶體裝置100/101/102/103具有升溫及降溫的功效,致使快閃記憶體裝置100/101/102/103可以操作在一預定的溫度區間,而增加快閃記憶體裝置100/101/102/103讀寫的穩定性。As described above, the heater chip 15 and the cooling fin 16 of the present invention are respectively disposed in a respective separate flash memory device 100, 101, 102, 103. However, in practical application design, the heating sheet 15 and the cooling sheet 16 may also be selected as a combined component and disposed in a single flash memory device 100/101/102/103 to enable the flash memory device. 100/101/102/103 has the effect of heating and cooling, so that the flash memory device 100/101/102/103 can operate in a predetermined temperature range, and the flash memory device 100/101/102/103 is added. The stability of reading and writing.

  以上所述者,僅為本發明之一較佳實施例而已,並非用來限定本發明實施之範圍,即凡依本發明申請專利範圍所述之形狀、構造、特徵及精神所為之均等變化與修飾,均應包括於本發明之申請專利範圍內。
The above description is only a preferred embodiment of the present invention, and is not intended to limit the scope of the present invention, which is equivalent to the changes in shape, structure, features and spirit of the present invention. Modifications are intended to be included in the scope of the patent application of the present invention.

100...快閃記憶體裝置100. . . Flash memory device

10...脈波訊號10. . . Pulse signal

11...控制模組11. . . Control module

111...第一下限溫度值111. . . First lower limit temperature value

112...第二下限溫度值112. . . Second lower limit temperature value

12...溫度感測器12. . . Temperature sensor

130...開關模組130. . . Switch module

15...加熱片15. . . Heating sheet

17...快閃記憶體元件17. . . Flash memory component

Claims (12)

一種可調整溫度之快閃記憶體裝置,包括:一溫度感測器,用以感測環境溫度;一加熱片,設置於至少一快閃記憶體元件之上;一開關模組,設置在一工作電源與加熱片之間;及一控制模組,連接溫度感測器及開關模組,當環境溫度低於一第一下限溫度值時,控制模組控制開關模組導通,以使工作電源經由開關模組供電至加熱片。A temperature-adjustable flash memory device includes: a temperature sensor for sensing an ambient temperature; a heater chip disposed on at least one of the flash memory components; and a switch module disposed in the Between the working power source and the heating sheet; and a control module, connected to the temperature sensor and the switch module, when the ambient temperature is lower than a first lower limit temperature value, the control module controls the switch module to be turned on, so that the working power source Power is supplied to the heater chip via the switch module. 如申請專利範圍第1項所述之快閃記憶體裝置,其中當環境溫度高於一第二下限溫度值時,該控制模組控制該開關模組關閉,以使該工作電源停止供電至該加熱片。The flash memory device of claim 1, wherein the control module controls the switch module to be turned off when the ambient temperature is higher than a second lower limit temperature value, so that the working power supply stops supplying power to the Heat the sheet. 如申請專利範圍第2項所述之快閃記憶體裝置,其中該第二下限溫度值將設定高於該第一下限溫度值。The flash memory device of claim 2, wherein the second lower limit temperature value is set to be higher than the first lower limit temperature value. 如申請專利範圍第1項所述之快閃記憶體裝置,其中該控制模組為一微控制器或一控制電路。The flash memory device of claim 1, wherein the control module is a microcontroller or a control circuit. 如申請專利範圍第1項所述之快閃記憶體裝置,其中該加熱片設置於該快閃記憶體裝置所有的元件之上。The flash memory device of claim 1, wherein the heater chip is disposed on all components of the flash memory device. 如申請專利範圍第1項所述之快閃記憶體裝置,其中該控制模組利用一週期性之脈波訊號或一單一準位之電壓訊號控制該開關模組之導通或關閉。The flash memory device of claim 1, wherein the control module controls the turn-on or turn-off of the switch module by using a periodic pulse signal or a single level voltage signal. 一種可調整溫度之快閃記憶體裝置,包括:一溫度感測器,用以感測環境溫度;一致冷片,設置於至少一快閃記憶體元件之上;一開關模組,設置在一工作電源與致冷片之間;及一控制模組,連接溫度感測器及開關模組,當環境溫度高於一第一上限溫度值時,控制模組控制開關模組導通,以使工作電源經由開關模組供電至致冷片。A temperature-adjustable flash memory device includes: a temperature sensor for sensing an ambient temperature; a uniform cold chip disposed on at least one of the flash memory components; and a switch module disposed in the Between the working power source and the cooling piece; and a control module, connected to the temperature sensor and the switch module, when the ambient temperature is higher than a first upper limit temperature value, the control module controls the switch module to be turned on to make the work The power is supplied to the cooling fin via the switch module. 如申請專利範圍第7項所述之快閃記憶體裝置,其中當環境溫度低於一第二上限溫度值時,該控制模組控制該開關模組關閉,以使該工作電源停止供電至該致冷片。The flash memory device of claim 7, wherein the control module controls the switch module to be turned off when the ambient temperature is lower than a second upper limit temperature, so that the working power supply stops supplying power to the Cooling film. 如申請專利範圍第8項所述之快閃記憶體裝置,其中該第二上限溫度值將設定低於該第一上限溫度值。The flash memory device of claim 8, wherein the second upper limit temperature value is set lower than the first upper limit temperature value. 如申請專利範圍第7項所述之快閃記憶體裝置,其中該控制模組為一微控制器或一控制電路。The flash memory device of claim 7, wherein the control module is a microcontroller or a control circuit. 如申請專利範圍第7項所述之快閃記憶體裝置,其中該致冷片設置於該快閃記憶體裝置所有的元件之上。The flash memory device of claim 7, wherein the refrigerating sheet is disposed on all components of the flash memory device. 如申請專利範圍第7項所述之快閃記憶體裝置,其中該控制模組利用一週期性之脈波訊號或一單一準位之電壓訊號控制該開關模組之導通或關閉。The flash memory device of claim 7, wherein the control module controls the turn-on or turn-off of the switch module by using a periodic pulse signal or a single level voltage signal.
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Publication number Priority date Publication date Assignee Title
TWI615849B (en) * 2017-03-16 2018-02-21 宇瞻科技股份有限公司 Control method for improving data retention on non-volatile storage device
TWI633553B (en) * 2017-03-14 2018-08-21 Powerchip Technology Corporation Flash memory device and refresh method thereof
TWI670716B (en) * 2018-09-26 2019-09-01 群聯電子股份有限公司 Data access method,memory storage device and memory control circuit unit
CN112786080A (en) * 2020-12-31 2021-05-11 深圳大普微电子科技有限公司 Method and device for reducing error rate of flash memory and solid state disk

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI633553B (en) * 2017-03-14 2018-08-21 Powerchip Technology Corporation Flash memory device and refresh method thereof
TWI615849B (en) * 2017-03-16 2018-02-21 宇瞻科技股份有限公司 Control method for improving data retention on non-volatile storage device
TWI670716B (en) * 2018-09-26 2019-09-01 群聯電子股份有限公司 Data access method,memory storage device and memory control circuit unit
CN112786080A (en) * 2020-12-31 2021-05-11 深圳大普微电子科技有限公司 Method and device for reducing error rate of flash memory and solid state disk

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