TW201439010A - Method for removing si from waste liquid of si-containing hydrofluoric acid, method for recovering hydrofluoric acid from mixed acid waste liquid of si-containing hydrofluoric acid, and recovery device - Google Patents

Method for removing si from waste liquid of si-containing hydrofluoric acid, method for recovering hydrofluoric acid from mixed acid waste liquid of si-containing hydrofluoric acid, and recovery device Download PDF

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TW201439010A
TW201439010A TW102141496A TW102141496A TW201439010A TW 201439010 A TW201439010 A TW 201439010A TW 102141496 A TW102141496 A TW 102141496A TW 102141496 A TW102141496 A TW 102141496A TW 201439010 A TW201439010 A TW 201439010A
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waste liquid
hydrofluoric acid
liquid
solid
salt
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TW102141496A
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TWI555706B (en
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Hideki Yamamoto
Koji Ono
Kaoru Ogawa
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Og Corp
Toyobo Eng Co Ltd
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Abstract

A removing method according to the present invention comprises a Si removing process which adds salts to a waste fluid containing hydrofluoric acid and Si and removes precipitates produced by the addition of the salts thereby obtaining Si-removed waste fluid. It is desirable to use one or more kinds of salts selected from the group consisting of metal fluoride salts and chloride metal salts for salts. According to the removing method, it is possible to effectively reduce or remove Si contained in Si-containing hydrofluoric acid waste fluid.

Description

從含有Si之氫氟酸系廢液去除Si之方法及從含有Si之氫氟酸系混酸廢液回收氫氟酸之方法以及回收裝置 Method for removing Si from a hydrofluoric acid-based waste liquid containing Si, and method for recovering hydrofluoric acid from a hydrofluoric acid-based mixed acid waste liquid containing Si, and a recovery device

本發明係關於例如從被使用作為半導體的蝕刻劑等之氫氟酸系廢液去除Si之方法,及從氫氟酸系混酸廢液回收氫氟酸之回收方法以及回收裝置。 The present invention relates to a method for removing Si from a hydrofluoric acid-based waste liquid such as an etchant used as a semiconductor, and a method for recovering hydrofluoric acid from a hydrofluoric acid-based mixed acid waste liquid, and a recovery apparatus.

目前,氫氟酸系水溶液、氫氟酸-鹽酸系水溶液、氫氟酸-硝酸系水溶液等之氫氟酸(氟化氫酸)系溶液,於半導體工廠等被使用作為蝕刻劑。由於重複進行蝕刻而導致蝕刻功能的降低,所以會從半導體工廠排出大量的氫氟酸系廢液。蝕刻後的氫氟酸系廢液中,混入有Si等金屬,故無法再利用,目前的情況是對該氫氟酸系廢液施以中和處理後排出(例如參考專利文獻1)。 At present, a hydrofluoric acid (hydrofluoric acid) solution such as a hydrofluoric acid aqueous solution, a hydrofluoric acid-hydrochloric acid aqueous solution, or a hydrofluoric acid-nitric acid aqueous solution is used as an etchant in a semiconductor factory or the like. Since the etching function is reduced by repeated etching, a large amount of hydrofluoric acid-based waste liquid is discharged from the semiconductor factory. In the hydrofluoric acid-based waste liquid after the etching, a metal such as Si is mixed, so that it cannot be reused. In the present case, the hydrofluoric acid-based waste liquid is subjected to a neutralization treatment and then discharged (for example, refer to Patent Document 1).

專利文獻1:日本特開2002-126722號公報(段落0002) Patent Document 1: Japanese Laid-Open Patent Publication No. 2002-126722 (paragraph 0002)

然而,由於前述中和處理而在排水中含有微量的氟,即使是少量,仍不可避免會成為環境污染的原因,從環境保全之觀點來看,施以中和處理後排出之方法絕非較佳的手段。 However, due to the aforementioned neutralization treatment, a trace amount of fluorine is contained in the drainage water, and even a small amount is inevitably caused by environmental pollution. From the viewpoint of environmental preservation, the method of applying the neutralization treatment is not a comparison. Good means.

此外,近年來氫氟酸的原料價格高漲,故強烈要求可再利用如此的氟資源。 In addition, in recent years, the price of raw materials for hydrofluoric acid has risen, so it is strongly demanded that such fluorine resources can be reused.

然而,當欲去除Si等之混入金屬而蒸餾上述氫氟酸系混酸廢液時,會生成SiF4(四氟化矽)等,由於該SiF4的揮發性高,所以會混入於餾出液中,結果無法得到Si被降低或去除之氫氟酸系混酸廢液。 However, when the hydrofluoric acid-based mixed acid waste liquid is distilled by removing the mixed metal such as Si, SiF 4 (antimony tetrafluoride) or the like is formed, and since the volatility of the SiF 4 is high, it is mixed in the distillate. As a result, it was not possible to obtain a hydrofluoric acid-based mixed acid waste liquid in which Si was reduced or removed.

本發明係鑒於該技術背景而創作出,該目的在於提供一種可有效率地降低或去除氫氟酸系廢液中所含有之Si之從含有Si之氫氟酸系廢液去除Si之方法,以及可從含有Si之氫氟酸系混酸廢液回收Si被降低或去除之氫氟酸之從含有Si之氫氟酸系混酸廢液回收氫氟酸之方法。 The present invention has been made in view of the above technical background, and an object thereof is to provide a method for efficiently removing or removing Si contained in a hydrofluoric acid-based waste liquid and removing Si from a hydrofluoric acid-based waste liquid containing Si. And a method for recovering hydrofluoric acid from a hydrofluoric acid-based mixed acid waste liquid containing Si by recovering hydrofluoric acid in which Si is reduced or removed from a hydrofluoric acid-based mixed acid waste liquid containing Si.

為了達成前述目的,本發明係提供下列手段。 In order to achieve the foregoing objects, the present invention provides the following means.

[1]一種從含有Si之氫氟酸系廢液去除Si之方法,其特徵為包含:將鹽添加於含有氫氟酸及Si之廢液後,去除因該鹽的添加所產生之沉澱物而得到去除Si之廢液之Si去除步驟。 [1] A method for removing Si from a hydrofluoric acid-based waste liquid containing Si, comprising: adding a salt to a waste liquid containing hydrofluoric acid and Si, and removing a precipitate generated by the addition of the salt The Si removal step of removing the waste liquid of Si is obtained.

[2]一種從含有Si之氫氟酸系廢液去除Si之方法,其特徵為包含:將鹽添加於含有氫氟酸及Si之廢液後,去 除因該鹽的添加所產生之沉澱物而得到去除Si之廢液之Si去除步驟;以及藉由蒸餾前述去除Si之廢液,使含有氫氟酸之液體餾出而得到餾出液之蒸餾步驟。 [2] A method for removing Si from a hydrofluoric acid-based waste liquid containing Si, which comprises: adding a salt to a waste liquid containing hydrofluoric acid and Si, and then removing a Si removing step of removing a waste liquid for removing Si by a precipitate generated by the addition of the salt; and distilling the liquid containing hydrofluoric acid by distilling the waste liquid containing Si by distillation to obtain a distillate step.

[3]如前項1或2之從含有Si之氫氟酸系廢液去除Si之方法,其中前述鹽係使用選自由氟化金屬鹽及氯化金屬鹽所組成之群組之1種或2種以上的鹽。 [3] The method for removing Si from a hydrofluoric acid-based waste liquid containing Si according to the above item 1 or 2, wherein the salt is one or two selected from the group consisting of a metal fluoride salt and a metal chloride salt. More than one kind of salt.

[4]如前項1或2之從含有Si之氫氟酸系廢液去除Si之方法,其中前述鹽係使用選自由氟化鉀、氟化鈉、氯化鉀、氯化鈉、氟化鎂及氟化鋰所組成之群組之1種或2種以上的鹽。 [4] The method for removing Si from a hydrofluoric acid-based waste liquid containing Si according to the above item 1 or 2, wherein the salt is selected from the group consisting of potassium fluoride, sodium fluoride, potassium chloride, sodium chloride, magnesium fluoride. And one or more salts of the group consisting of lithium fluoride.

[5]如前項1至4項中任一項之從含有Si之氫氟酸系廢液去除Si之方法,其中前述將鹽添加於廢液之添加步驟,係經由供給管將前述廢液供給至混合槽,並同時將前述鹽供給至前述混合槽來進行,於該添加步驟之前,具備:藉由設置在前述供給管之質量流量計,測量通過該供給管之廢液的流量及密度之測量步驟;於計算機中,根據前述質量流量計所測量之前述流量及密度的資料,計算通過前述供給管之廢液中的Si質量,並根據該計算值來計算Si的沉澱化所需之鹽的質量之計算步驟;以及藉由計量器來計量前述計算機所計算之質量的鹽,並送入前述混合槽之計量步驟。 [5] The method for removing Si from a hydrofluoric acid-based waste liquid containing Si according to any one of the items 1 to 4, wherein the step of adding the salt to the waste liquid is to supply the waste liquid through a supply pipe. The mixing tank is supplied to the mixing tank at the same time, and before the adding step, the flow rate and the density of the waste liquid passing through the supply pipe are measured by a mass flow meter provided in the supply pipe. a measuring step; calculating, in the computer, the mass of Si in the waste liquid passing through the supply pipe according to the aforementioned flow rate and density measured by the mass flow meter, and calculating a salt required for precipitation of Si according to the calculated value a calculation step of the mass; and a metering step of measuring the mass of the mass calculated by the computer and feeding the salt into the mixing tank.

[6]一種從含有Si之氫氟酸系混酸廢液回收氫氟酸之方法,其特徵為包含:將鹽添加於含有氫氟酸、鹽酸及Si之混酸廢液後,去除因該鹽的添加所產生之沉澱物而得到去除Si之混酸廢液之Si去除步驟;藉由蒸餾前述去除Si之混酸廢液,使混酸液餾出而得到第1餾出液之第1蒸餾步驟;以及藉由蒸餾在前述第1蒸餾步驟所得之第1餾出液,使混酸液餾出而得到第2餾出液,並且同時回收作為蒸餾殘液的氫氟酸濃縮混酸液之第2蒸餾步驟。 [6] A method for recovering hydrofluoric acid from a hydrofluoric acid-based mixed acid waste liquid containing Si, comprising: adding a salt to a mixed acid waste liquid containing hydrofluoric acid, hydrochloric acid, and Si, and removing the salt Adding the generated precipitate to obtain a Si removal step of removing the mixed acid waste liquid of Si; and distilling the mixed acid waste liquid of Si to distill off the mixed acid solution to obtain a first distillation step of the first distillate; The second distillate obtained by distilling the first distillate obtained in the first distillation step, distilling the mixed acid solution to obtain a second distillate, and simultaneously recovering the hydrofluoric acid concentrated mixed acid solution as a distillation residue.

[7]如前項6之從含有Si之氫氟酸系混酸廢液回收氫氟酸之方法,其中將前述第1蒸餾步驟中的蒸餾溫度設定在80℃~130℃的範圍。 [7] The method for recovering hydrofluoric acid from a hydrofluoric acid-based mixed acid waste liquid containing Si according to the above item 6, wherein the distillation temperature in the first distillation step is set in a range of from 80 °C to 130 °C.

[8]如前項6或7之從含有Si之氫氟酸系混酸廢液回收氫氟酸之方法,其中將前述第2蒸餾步驟中的蒸餾溫度設定在80℃~130℃的範圍。 [8] The method for recovering hydrofluoric acid from a hydrofluoric acid-based mixed acid waste liquid containing Si according to the above item 6 or 7, wherein the distillation temperature in the second distillation step is set in a range of from 80 °C to 130 °C.

[9]如前項6至8中任一項之從含有Si之氫氟酸系混酸廢液回收氫氟酸之方法,其中前述鹽係使用選自由氟化金屬鹽及氯化金屬鹽所組成之群組之1種或2種以上的鹽。 [9] The method for recovering hydrofluoric acid from a hydrofluoric acid-based mixed acid waste liquid containing Si according to any one of items 6 to 8, wherein the salt is selected from the group consisting of a metal fluoride salt and a metal chloride salt. One or two or more salts of the group.

[10]如前項6至8中任一項之從含有Si之氫氟酸系混酸廢液回收氫氟酸之方法,其中前述鹽係使用選自由氟化鉀、氟化鈉、氯化鉀、氯化鈉、氟化鎂及氟化鋰所組成之群組之1種或2種以上的鹽。 [10] The method for recovering hydrofluoric acid from a hydrofluoric acid-based mixed acid waste liquid containing Si according to any one of items 6 to 8, wherein the salt is selected from the group consisting of potassium fluoride, sodium fluoride, potassium chloride, One or two or more salts of the group consisting of sodium chloride, magnesium fluoride, and lithium fluoride.

[11]如前項6至10中任一項之從含有Si之氫氟酸系 混酸廢液回收氫氟酸之方法,其中前述將鹽添加於廢液之添加步驟,係經由供給管將前述廢液供給至混合槽,並將前述鹽供給至前述混合槽來進行,於該添加步驟之前,具備:藉由設置在前述供給管之質量流量計,測量通過該供給管之廢液的流量及密度之測量步驟;於計算機中,根據前述質量流量計所測量之前述流量及密度的資料,計算通過前述供給管之廢液中的Si質量,並根據該計算值來計算Si的沉澱化所需之鹽的質量之計算步驟;以及藉由計量器來計量前述計算機所計算之質量的鹽,並送入前述混合槽之計量步驟。 [11] The hydrofluoric acid system containing Si according to any one of items 6 to 10 above A method for recovering hydrofluoric acid from a mixed acid waste liquid, wherein the step of adding a salt to the waste liquid is performed by supplying the waste liquid to a mixing tank via a supply pipe, and supplying the salt to the mixing tank, and adding Before the step, there is: a measuring step of measuring a flow rate and a density of the waste liquid passing through the supply pipe by a mass flow meter disposed in the supply pipe; and the flow rate and the density measured by the mass flow meter in the computer Data, calculating a mass of Si in the waste liquid passing through the supply tube, and calculating a mass of the salt required for precipitation of Si based on the calculated value; and measuring the mass calculated by the computer by a meter The salt is fed to the metering step of the aforementioned mixing tank.

[12]一種從含有Si之氫氟酸系廢液回收氫氟酸之回收裝置,其特徵為具備:藉由攪拌來混合含有氫氟酸及Si之廢液、及鹽,而得到混合液之混合槽,用於對存在於前述混合液中之沉澱物進行固液分離之固液分離機,以及用於對由前述固液分離機所分離出之濾液進行蒸餾之蒸餾塔。 [12] A recovery apparatus for recovering hydrofluoric acid from a hydrofluoric acid-based waste liquid containing Si, comprising: mixing a waste liquid containing hydrofluoric acid and Si and a salt by stirring to obtain a mixed liquid; a mixing tank for a solid-liquid separator for solid-liquid separation of a precipitate present in the mixed liquid, and a distillation column for distilling the filtrate separated by the solid-liquid separator.

[13]一種從含有Si之氫氟酸系混酸廢液回收氫氟酸之回收裝置,其特徵為具備:藉由攪拌來混合含有氫氟酸及Si之混酸廢液、及鹽,而得到混合液之混合槽,用於對存在於前述混合液中之沉澱物進行固液分離之固液分離機, 用於對由前述固液分離機所分離出之濾液進行蒸餾之第1蒸餾塔,以及用於對從前述第1蒸餾塔餾出之餾出液進行蒸餾之第2蒸餾塔。 [13] A recovery apparatus for recovering hydrofluoric acid from a hydrofluoric acid-based mixed acid waste liquid containing Si, comprising: mixing a mixed acid waste liquid containing hydrofluoric acid and Si and a salt by stirring to obtain a mixture a liquid mixing tank for solid-liquid separator for solid-liquid separation of a precipitate present in the above-mentioned mixed liquid, a first distillation column for distilling the filtrate separated by the solid-liquid separator, and a second distillation column for distilling the distillate distilled from the first distillation column.

[14]如前項12或13之回收裝置,其中進一步具備:設置在將前述廢液供給至前述混合槽之供給管,並測量通過該供給管之廢液的流量及密度之質量流量計,根據前述質量流量計所測量之前述流量及密度的資料,計算通過前述供給管之廢液中的Si質量,並根據該計算值來計算Si的沉澱化所需之鹽的質量之計算機,以及計量前述計算機所計算之質量的鹽,並送入前述混合槽之計量器。 [14] The recovery device according to the above item 12 or 13, further comprising: a mass flow meter provided in the supply pipe for supplying the waste liquid to the mixing tank, and measuring the flow rate and density of the waste liquid passing through the supply pipe, according to a data of the aforementioned flow rate and density measured by the mass flow meter, a calculation of the mass of Si in the waste liquid of the supply pipe, and a calculation of the mass of the salt required for the precipitation of Si based on the calculated value, and the measurement of the foregoing The mass of the salt calculated by the computer is fed to the meter of the aforementioned mixing tank.

[15]一種固液分離裝置,其特徵為具備:可分離固體成分與液體,且可從底部排出分離後之固體成分之固液分離機,容納從前述固液分離機的底部排出之固體成分之污泥罐,與設置在前述污泥罐的底部之排出口連通之排出管,設置在前述排出管之排出閥,以及檢測被容納於前述污泥罐的內部之固體成分的上面位置之界面位置檢測器。 [15] A solid-liquid separation device comprising: a solid-liquid separator capable of separating a solid component and a liquid, and discharging the separated solid component from a bottom portion, and accommodating a solid component discharged from a bottom portion of the solid-liquid separator a sludge tank connected to a discharge port provided at a bottom of the sludge tank, a discharge valve provided in the discharge pipe, and an interface for detecting an upper position of a solid component contained in the sludge tank Position detector.

[16]如前項15之固液分離裝置,其中使用超音波界面檢測計作為前述界面位置檢測器。 [16] The solid-liquid separation device according to Item 15, wherein an ultrasonic interface detector is used as the aforementioned interface position detector.

[17]如前項15或16之固液分離裝置,其中使用液體渦旋機作為前述固液分離機。 [17] The solid-liquid separation device according to the above item 15 or 16, wherein a liquid scroll machine is used as the aforementioned solid-liquid separator.

[18]如前項15至17中任一項之固液分離裝置,其係具備:將前述固液分離機所分離之液體再供給至該固液分離機內之循環管。 [18] The solid-liquid separation device according to any one of the items 15 to 17, further comprising: a circulation pipe that supplies the liquid separated by the solid-liquid separator to the solid-liquid separator.

[19]如前項15至18中任一項之固液分離裝置,其係具備:根據前述界面位置檢測器所檢測之固體成分之上面位置的資料,進行前述排出閥的開閉操作或開度調整之控制部。 [19] The solid-liquid separation device according to any one of the items 15 to 18, wherein the opening/closing operation or the opening degree adjustment of the discharge valve is performed based on information on an upper position of a solid component detected by the interface position detector. The control department.

[20]如前項15至18中任一項之固液分離裝置,其係具備:以當前述界面位置檢測器所檢測之固體成分的上面位置上升至前述污泥罐內的第1既定高度時,開啟前述排出閥以排出前述污泥罐內的固體成分,並且當由於前述固體成分的排出使前述界面位置檢測器所檢測之固體成分的上面位置下降至前述污泥罐內的第2既定高度時,關閉前述排出閥之方式進行控制之控制部。 [20] The solid-liquid separation device according to any one of the items 15 to 18, wherein when the upper position of the solid component detected by the interface position detector rises to a first predetermined height in the sludge tank Opening the discharge valve to discharge the solid content in the sludge tank, and lowering the upper position of the solid component detected by the interface position detector to the second predetermined height in the sludge tank due to the discharge of the solid component At the time, the control unit that controls the discharge valve is closed.

[21]如前項15至18中任一項之固液分離裝置,其係具備:以當前述界面位置檢測器所檢測之固體成分的上面位置下降時,減少前述排出閥的開放度,當前述界面位置檢測器所檢測之固體成分的上面位置上升時,增大前述排出閥的開放度之方式進行控制,藉此將前述污泥罐內之固體成分的上面位置控制在大致一定的位置之控制部。 [21] The solid-liquid separation device according to any one of the items 15 to 18, wherein, when the upper position of the solid component detected by the interface position detector is lowered, the opening degree of the discharge valve is reduced. When the upper position of the solid component detected by the interface position detector rises, the opening degree of the discharge valve is increased to control the upper position of the solid component in the sludge tank to be controlled at a substantially constant position. unit.

[1]的發明中,藉由將鹽添加於含有氫氟酸及Si之廢液,可生成含有Si之沉澱物,因此可藉由去除該沉澱物來得到去除Si之廢液。由於可沉澱去除Si,故例如在對廢液進行蒸餾操作時,SiF4(揮發性高之物質)不會混入於餾出液中。因此可回收Si等之雜質少的餾出液(氫氟酸或混酸等)。 In the invention of [1], by adding a salt to a waste liquid containing hydrofluoric acid and Si, a precipitate containing Si can be formed. Therefore, the waste liquid from which Si is removed can be obtained by removing the precipitate. Since Si can be precipitated and removed, for example, when the waste liquid is subjected to a distillation operation, SiF 4 (highly volatile substance) is not mixed into the distillate. Therefore, it is possible to recover a distillate (hydrofluoric acid or mixed acid, etc.) having less impurities such as Si.

[2]的發明中,藉由將鹽添加於含有氫氟酸及Si之廢液,可生成含有Si之沉澱物,因此可藉由去除該沉澱物來得到去除Si之廢液。接著藉由蒸餾去除Si之廢液,可不會使存在於廢液之Si以外的金屬成分餾出而殘留於蒸餾塔內等,故可回收雜質(Si或Si以外的金屬成分)少之餾出液(含有氫氟酸之液體或含有混酸之液體等)。如此,由於餾出液的雜質少,所以可再利用。此外,不須對廢液進行中和處理,所以可降低廢液處理成本。 In the invention of [2], by adding a salt to a waste liquid containing hydrofluoric acid and Si, a precipitate containing Si can be formed. Therefore, the waste liquid from which Si is removed can be obtained by removing the precipitate. Then, by removing the waste liquid of Si by distillation, the metal component other than Si existing in the waste liquid can be distilled off and left in the distillation column or the like, so that it is possible to recover a small amount of impurities (metal components other than Si or Si). Liquid (liquid containing hydrofluoric acid or liquid containing mixed acid, etc.). In this way, since the distillate has less impurities, it can be reused. In addition, it is not necessary to neutralize the waste liquid, so the waste liquid treatment cost can be reduced.

[3]的發明中,由於鹽使用選自由氟化金屬鹽及氯化金屬鹽所組成之群組之1種或2種以上的鹽,所以可得到充分去除Si後之廢液。 In the invention of the above [3], since the salt is one or two or more salts selected from the group consisting of a metal fluoride salt and a metal chloride salt, a waste liquid in which Si is sufficiently removed can be obtained.

[4]的發明中,由於鹽使用選自由氟化鉀、氟化鈉、氯化鉀、氯化鈉、氟化鎂及氟化鋰所組成之群組之1種或2種以上的鹽,所以可得到更充分地去除Si後之廢液。 In the invention of [4], the salt is one or more salts selected from the group consisting of potassium fluoride, sodium fluoride, potassium chloride, sodium chloride, magnesium fluoride, and lithium fluoride. Therefore, the waste liquid after removing Si more fully can be obtained.

[5]的發明中,由於可精度高且自動地將Si的沉澱化所需之量的鹽供給至混合槽,所以可有效率且高精度地處理廢液。 In the invention of [5], since the salt required for the precipitation of Si can be supplied to the mixing tank with high precision and automatically, the waste liquid can be efficiently and accurately processed.

[6]的發明中,藉由將鹽添加於含有氫氟酸、鹽酸及 Si之混酸廢液,可生成含有Si之沉澱物,因此可藉由去除該沉澱物來得到去除Si之混酸廢液。接著藉由蒸餾去除Si之混酸廢液,可不會使存在於混酸廢液之Si以外的金屬成分餾出而殘留於蒸餾塔內等,故可回收雜質(Si或Si以外的金屬成分)少之第1餾出液(含有混酸之液體)。然後藉由蒸餾該第1餾出液,可回收雜質少之氫氟酸濃縮混酸液作為蒸餾殘液,並回收雜質少之混酸液作為餾出液(第2餾出液)。如此,由於蒸餾殘液及餾出液的雜質少,所以可再利用。此外,不須對混酸廢液進行中和處理,所以可降低廢液處理成本。 In the invention of [6], by adding a salt to hydrofluoric acid, hydrochloric acid, and The mixed acid waste liquid of Si can form a precipitate containing Si, so that the mixed acid waste liquid from which Si is removed can be obtained by removing the precipitate. Then, by removing the mixed acid waste liquid of Si by distillation, the metal component other than Si existing in the mixed acid waste liquid can be distilled off and left in the distillation column or the like, so that impurities (metal components other than Si or Si) can be recovered. The first distillate (liquid containing a mixed acid). Then, by distilling the first distillate, a hydrofluoric acid concentrated mixed acid solution having a small amount of impurities can be recovered as a distillation residue, and a mixed acid solution having a small amount of impurities can be recovered as a distillate (second distillate). In this way, since the distillation residue and the distillate have few impurities, they can be reused. In addition, it is not necessary to neutralize the mixed acid waste liquid, so the waste liquid treatment cost can be reduced.

[7]的發明中,由於將第1蒸餾步驟中的蒸餾溫度設定在80℃~130℃的範圍,所以可充分地餾出含有混酸之液體作為第1餾出液。 In the invention of the above [7], since the distillation temperature in the first distillation step is set in the range of 80 ° C to 130 ° C, the liquid containing the mixed acid can be sufficiently distilled as the first distillate.

[8]的發明中,由於將第2蒸餾步驟中的蒸餾溫度設定在80℃~130℃的範圍,所以可使氫氟酸濃縮混酸液充分地殘留於蒸餾殘液,並且充分地餾出混酸液作為餾出液(第2餾出液)。此外,可提升作為蒸餾殘液之氫氟酸的濃縮率。 In the invention of [8], since the distillation temperature in the second distillation step is set in the range of 80 ° C to 130 ° C, the hydrofluoric acid concentrated mixed acid solution can be sufficiently left in the distillation residual liquid, and the mixed acid can be sufficiently distilled off. The liquid was used as a distillate (second distillate). Further, the concentration ratio of hydrofluoric acid as a distillation residue can be increased.

[9]的發明中,由於鹽使用選自由氟化金屬鹽及氯化金屬鹽所組成之群組之1種或2種以上的鹽,所以可得到充分去除Si後之混酸廢液,並可分別回收雜質少之氫氟酸濃縮混酸液、及雜質少之混酸液。 In the invention of the above [9], since the salt is one or more salts selected from the group consisting of a metal fluoride salt and a metal chloride salt, a mixed acid waste liquid in which Si is sufficiently removed can be obtained, and The hydrofluoric acid concentrated mixed acid solution with less impurities and the mixed acid solution with less impurities are separately recovered.

[10]的發明中,由於鹽使用選自由氟化鉀、氟化鈉、氯化鉀、氯化鈉、氟化鎂及氟化鋰所組成之群組之1種或 2種以上的鹽,所以可得到充分去除Si後之混酸廢液,並可分別回收雜質更少之氫氟酸濃縮混酸液、及雜質更少之混酸液。 In the invention of [10], the salt is selected from the group consisting of potassium fluoride, sodium fluoride, potassium chloride, sodium chloride, magnesium fluoride, and lithium fluoride or Since two or more kinds of salts are used, it is possible to obtain a mixed acid waste liquid after sufficiently removing Si, and to separately collect a hydrofluoric acid concentrated mixed acid solution having less impurities and a mixed acid solution having less impurities.

[11]的發明中,由於可精度高且自動地將Si的沉澱化所需之量的鹽供給至混合槽,所以能夠以充分的處理速度,分別回收雜質更少之氫氟酸濃縮混酸液、及雜質更少之混酸液。 In the invention of [11], since the salt required for the precipitation of Si can be supplied to the mixing tank with high precision and automatically, it is possible to recover the hydrofluoric acid concentrated mixed acid having less impurities at a sufficient processing speed. And mixed acid with less impurities.

[12]的發明中,由於具備混合槽、固液分離機及蒸餾塔,所以在混合槽中,可生成含有Si之沉澱物,且可藉由固液分離機從廢液中分離該沉澱物,接著藉由蒸餾塔中的蒸餾操作,可在不會餾出Si以外的金屬成分下殘留於蒸餾塔內,藉由此等操作,可回收雜質(Si或Si以外的金屬成分)少之餾出液(氫氟酸濃縮混酸液或含有混酸之液體等)。 In the invention of [12], since the mixing tank, the solid-liquid separator, and the distillation column are provided, a precipitate containing Si can be formed in the mixing tank, and the precipitate can be separated from the waste liquid by a solid-liquid separator. Then, by the distillation operation in the distillation column, it is possible to remain in the distillation column without distilling off the metal component other than Si, and by this operation, it is possible to recover a small amount of impurities (metal components other than Si or Si). Effluent (hydrofluoric acid concentrated mixed acid or liquid containing mixed acid, etc.).

[13]的發明中,由於具備混合槽、固液分離機、第1蒸餾塔及第2蒸餾塔,所以在混合槽中,可生成含有Si之沉澱物,且可藉由固液分離機從廢液中分離該沉澱物,接著藉由第1蒸餾塔中的蒸餾操作,可在不會餾出Si以外的金屬成分下殘留於第1蒸餾塔內,藉此可回收雜質(Si或Si以外的金屬成分)少之第1餾出液(含有混酸之液體等)。然後藉由第2蒸餾塔對第1餾出液進行蒸餾操作,藉此可回收雜質少之氫氟酸濃縮混酸液作為蒸餾殘液,並回收雜質少之混酸液作為餾出液(第2餾出液)。 In the invention of [13], since the mixing tank, the solid-liquid separator, the first distillation column, and the second distillation column are provided, a precipitate containing Si can be formed in the mixing tank, and the solid-liquid separator can be used. The precipitate is separated from the waste liquid, and then, by the distillation operation in the first distillation column, the metal component other than Si can be distilled out in the first distillation column, whereby impurities can be recovered (other than Si or Si). The metal component is a first distillate (containing a mixed acid or the like). Then, the first distillate is subjected to a distillation operation by the second distillation column, whereby a hydrofluoric acid concentrated mixed acid solution having a small amount of impurities can be recovered as a distillation residue, and a mixed acid solution having a small amount of impurities is recovered as a distillate (second distillation) Liquid).

[14]的發明中,可精度高且自動地將Si的沉澱化所需 之量的鹽供給至混合槽。[12]~[14]的發明之回收裝置,不論送液為分批方式或連續方式均可對應。 In the invention of [14], it is possible to accurately and automatically precipitate Si The amount of salt is supplied to the mixing tank. The recycling device of the invention of [12] to [14] can be used regardless of whether the liquid feeding is in a batch mode or a continuous mode.

[15]的發明之裝置,為適用在固體成分混合存在於廢液中時之裝置,根據該裝置,由於具備容納從固液分離機的底部排出之固體成分之污泥罐,所以可防止固體成分充滿於固液分離機內而阻塞之情形。此外,由於具備檢測被容納於污泥罐的內部之固體成分的上面位置之界面位置檢測器,所以可根據固體成分的上面位置之資料來控制排出閥的開閉或開度等,在不極力地排出液體(混酸等)下,僅極力地排出固體成分。亦即可提升回收液(回收混酸等)的回收率。當供給液中的固體成分(沉澱物)濃度產生變動時(通常此種情形在廢液中較多),本發明之固液分離裝置特別有效(對回收率之提升為有效)。本發明之固液分離裝置,不論送液為分批方式或連續方式均可對應。 The apparatus of the invention of [15] is applicable to a device in which a solid component is mixed and stored in a waste liquid, and according to the device, since the sludge tank containing the solid component discharged from the bottom of the solid-liquid separator is provided, solids can be prevented The component is filled in the solid-liquid separator and blocked. In addition, since the interface position detector for detecting the upper position of the solid component contained in the interior of the sludge tank is provided, the opening and closing or opening degree of the discharge valve can be controlled based on the information of the upper position of the solid component, and the like. Under the discharge of liquid (mixed acid, etc.), only the solid components are discharged as much as possible. It is also possible to increase the recovery rate of the recovered liquid (recovery of mixed acid, etc.). The solid-liquid separation device of the present invention is particularly effective (the increase in recovery rate is effective) when the concentration of the solid component (precipitate) in the supply liquid fluctuates (generally, this case is more in the waste liquid). The solid-liquid separation device of the present invention can be used regardless of whether the liquid supply is in a batch mode or a continuous mode.

[16]的發明中,由於使用超音波界面檢測計作為界面位置檢測器,故能夠以高精度檢測出污泥罐內部之固體成分的上面位置。 In the invention of [16], since the ultrasonic interface detector is used as the interface position detector, the upper position of the solid content inside the sludge tank can be detected with high precision.

[17]的發明中,由於使用液體渦旋機作為固液分離機,所以可達到小型化,並且提升固液分離的處理能力(處理速度)。 In the invention of [17], since the liquid scroll is used as the solid-liquid separator, it is possible to achieve miniaturization and to improve the processing ability (processing speed) of the solid-liquid separation.

[18]的發明中,由於具備將固液分離機所分離之液體再供給至該固液分離機內之循環管,所以可經由該循環管再供給至固液分離機內,藉此,具有可充分地降低回收液 (回收混酸等)中之固體雜質的含有率之優點。 In the invention of [18], since the circulation pipe for supplying the liquid separated by the solid-liquid separator to the solid-liquid separator is further provided, it can be supplied to the solid-liquid separator through the circulation pipe, thereby having Can fully reduce the recovery liquid The advantage of the content of solid impurities in (recovering mixed acid, etc.).

[19]的發明中,由於具備:根據界面位置檢測器所檢測之固體成分之上面位置的資料,進行排出閥的開閉操作或開度調整之控制部,所以可極力地避免液體(混酸等)從污泥罐之排出。 In the invention of the invention, the control unit for opening and closing the opening and closing the opening of the discharge valve is provided based on the information on the position of the upper surface of the solid component detected by the interface position detector, so that liquid (mixed acid, etc.) can be avoided as much as possible. Discharge from the sludge tank.

[20]的發明中,由於具備進行前述特定控制之控制部,所以可極力地避免將液體(混酸等)與固體成分一同地排出,而進一步提高回收液(混酸回收液、氫氟酸濃縮混酸回收液等)的回收率。此外,當以分批操作來實施廢液處理時,藉由以分批操作來實施,可進一步提高回收液的回收率。 In the invention of [20], since the control unit that performs the specific control is provided, it is possible to prevent the liquid (mixed acid or the like) from being discharged together with the solid component as much as possible, and further improve the recovery liquid (mixed acid recovery liquid, hydrofluoric acid concentrated mixed acid) Recovery rate of recycled liquid, etc.). Further, when the waste liquid treatment is carried out in a batch operation, the recovery rate of the recovered liquid can be further improved by performing the batch operation.

[21]的發明中,由於具備進行前述特定控制之控制部,所以可極力地避免將液體(混酸等)與固體成分一同地排出,而進一步提高回收液(混酸回收液、氫氟酸濃縮混酸回收液等)的回收率。 In the invention of [21], since the control unit that performs the specific control is provided, it is possible to prevent the liquid (mixed acid or the like) from being discharged together with the solid component as much as possible, and further improve the recovery liquid (mixed acid recovery liquid, hydrofluoric acid concentrated mixed acid) Recovery rate of recycled liquid, etc.).

1‧‧‧回收裝置 1‧‧‧Recycling device

9‧‧‧混合槽 9‧‧‧ mixing tank

10‧‧‧固液分離機 10‧‧‧ solid liquid separator

11‧‧‧第1蒸餾塔 11‧‧‧1st distillation tower

12‧‧‧第2蒸餾塔 12‧‧‧2nd distillation tower

23‧‧‧固體成分去除裝置(固液分離機) 23‧‧‧ Solid component removal device (solid-liquid separator)

25‧‧‧質量流量計 25‧‧‧Mass flow meter

26‧‧‧計算機 26‧‧‧ computer

27‧‧‧計量器 27‧‧‧meter

31‧‧‧供給管 31‧‧‧Supply tube

43、63‧‧‧固液分離機 43, 63‧‧‧ solid liquid separator

44、64‧‧‧污泥罐 44, 64‧‧‧Sludge tank

45、65‧‧‧排出管 45, 65‧‧‧ discharge tube

46、66‧‧‧排出閥 46, 66‧‧‧ discharge valve

47、67‧‧‧界面位置檢測器 47, 67‧‧‧ interface position detector

48、68‧‧‧控制部 48, 68‧‧‧Control Department

50‧‧‧循環管 50‧‧‧Circulation tube

52、72‧‧‧排出口 52, 72‧‧‧Export

81‧‧‧第1既定高度 81‧‧‧1st established height

82‧‧‧第2既定高度 82‧‧‧2nd established height

83‧‧‧大致一定的高度位置 83‧‧‧About a certain height position

100A、100B‧‧‧固液分離裝置(固液分離系統) 100A, 100B‧‧‧ solid-liquid separation device (solid-liquid separation system)

第1圖係顯示本發明之去除方法及回收方法的一例之概略說明圖。 Fig. 1 is a schematic explanatory view showing an example of a removal method and a recovery method of the present invention.

第2圖係顯示本發明之去除方法及回收方法所使用之裝置中之鹽自動添加系統的一例之概略說明圖(詳細顯示第1圖的一部分之構成圖)。 Fig. 2 is a schematic explanatory view showing an example of an automatic salt adding system in the apparatus used in the removal method and the recovery method of the present invention (a detailed configuration diagram of Fig. 1 is shown in detail).

第3圖係顯示使用本發明的一實施形態之固液分離裝置所構成之回收裝置的全體之概略構成圖。 Fig. 3 is a schematic block diagram showing the entire collection device using the solid-liquid separation device according to the embodiment of the present invention.

第4圖係顯示使用本發明的一實施形態之固液分離裝置所構成之回收裝置的一部分之詳細構成圖(詳細顯示第3圖之裝置的一部分之構成圖)。 Fig. 4 is a view showing a detailed configuration of a part of a recovery apparatus using a solid-liquid separation device according to an embodiment of the present invention (a detailed configuration diagram of a part of the apparatus shown in Fig. 3).

第5圖係顯示安裝有界面位置檢測器之污泥罐之縱向剖面圖。 Figure 5 is a longitudinal cross-sectional view showing a sludge tank equipped with an interface position detector.

本發明之從含有Si4+之氫氟酸系廢液去除Si4+之方法,其特徵為包含:將鹽添加於含有氫氟酸及Si4+之廢液後,去除因該鹽的添加所產生之沉澱物而得到去除Si4+之廢液之Si4+去除步驟。 A method for removing Si 4+ from a hydrofluoric acid-based waste liquid containing Si 4+ according to the present invention, comprising: adding a salt to a waste liquid containing hydrofluoric acid and Si 4+ , and removing the addition of the salt The resulting precipitate is subjected to a Si 4+ removal step of removing the Si 4+ waste liquid.

根據上述去除方法,可藉由將鹽添加於含有氫氟酸及Si4+之廢液而產生含有Si4+之沉澱物,故可藉由去除該沉澱物而得到去除Si4+之廢液。由於可藉由鹽的添加而沉澱去除Si4+,故例如在前述去除步驟後對去除Si4+之廢液進行蒸餾操作時,SiF4(揮發性高之物質)不會混入於餾出液中。 The above-described removal method, by adding a salt containing waste liquid of hydrofluoric acid and Si 4+ to produce a precipitate containing the Si 4+, it can be removed by the precipitate obtained by removing the waste Si 4+ . Since Si 4+ can be precipitated and removed by the addition of a salt, for example, when the waste liquid from which Si 4+ is removed is subjected to a distillation operation after the above removal step, SiF 4 (highly volatile substance) is not mixed into the distillate. in.

在前述Si4+去除步驟後,較佳係設置:藉由蒸餾前述去除Si4+之廢液使含有氫氟酸之液體餾出而得到餾出液之第1蒸餾步驟。此時,藉由去除Si4+之廢液的蒸餾操作,能夠不餾出Si以外的金屬成分而殘留於蒸餾塔內等,而回收雜質(Si或Si以外的金屬成分等)少之含有氫氟酸之液體(含有氫氟酸之液體或含有氫氟酸之含有混酸液體)作為餾出液。 After the step of removing the Si 4+, preferred system settings: the removal by distillation of Si 4+ waste liquid containing hydrofluoric acid and distilled off to obtain a first distillate of the distillation step. At this time, by the distillation operation of removing the waste liquid of Si 4+ , it is possible to remove the metal component other than Si and leave it in the distillation column or the like, thereby recovering impurities (metal components other than Si or Si) and containing hydrogen. A liquid of fluoric acid (a liquid containing hydrofluoric acid or a mixed acid liquid containing hydrofluoric acid) is used as a distillate.

適用上述去除方法之對象的廢液,例如可列舉出: The waste liquid to which the object of the above removal method is applied may, for example, be:

‧含有Si4+及氫氟酸(氟化氫酸)之廢液 ‧ Waste liquid containing Si 4+ and hydrofluoric acid (hydrogen fluoride)

‧含有Si4+、鹽酸及氫氟酸(氟化氫酸)之混酸廢液 ‧ Mixed acid waste liquid containing Si 4+ , hydrochloric acid and hydrofluoric acid (hydrogen fluoride)

‧含有Si4+、硝酸及氫氟酸(氟化氫酸)之混酸廢液等。 ‧ Mixed acid waste liquid containing Si 4+ , nitric acid and hydrofluoric acid (hydrogen fluoride).

前述廢液除了含有氫氟酸之外,更可含有其他酸。此外,前述混酸廢液除了含有鹽酸與氫氟酸之外,更可含有其他酸。從半導體製造工廠排出之氫氟酸系混酸廢液中,除了溶存作為H2SiF6之Si4+之外,較多是含有Si以外的其他金屬離子。 The aforementioned waste liquid may contain other acids in addition to hydrofluoric acid. Further, the aforementioned mixed acid waste liquid may contain other acids in addition to hydrochloric acid and hydrofluoric acid. In the hydrofluoric acid-based mixed acid waste liquid discharged from the semiconductor manufacturing plant, in addition to the Si 4+ which is H 2 SiF 6 , most of the metal ions other than Si are contained.

此外,本發明之從含有Si4+之氫氟酸系混酸廢液回收氫氟酸之方法,其特徵為包含:將鹽添加於含有氫氟酸、鹽酸及Si4+之混酸廢液後,去除因該鹽的添加所產生之沉澱物而得到去除Si4+之混酸廢液之Si4+去除步驟;藉由蒸餾前述去除Si4+之混酸廢液,使混酸液餾出而得到第1餾出液之第1蒸餾步驟;以及藉由蒸餾在前述第1蒸餾步驟所得之第1餾出液,使混酸液餾出而得到第2餾出液,並且回收氫氟酸濃縮混酸液作為蒸餾殘液之第2蒸餾步驟。 Further, in the method for recovering hydrofluoric acid from a hydrofluoric acid-based mixed acid waste liquid containing Si 4+ according to the present invention, the method comprises the steps of: adding a salt to a mixed acid waste liquid containing hydrofluoric acid, hydrochloric acid and Si 4+ ; removed by the addition of the salt of the resulting precipitate was obtained by removing Si 4+ mixed acid waste liquid of the step of removing the Si 4+; Si 4+ removed by distillation of the waste mixed acid, mixed acid so obtained first distillate a first distillation step of distillate; and distilling the first distillate obtained in the first distillation step to distill off the mixed acid solution to obtain a second distillate, and recovering the hydrofluoric acid concentrated mixed acid solution as a distillation The second distillation step of the raffinate.

根據上述回收方法,可藉由將鹽添加於含有氫氟酸、鹽酸及Si4+之混酸廢液而產生含有Si4+之沉澱物,故可藉由去除該沉澱物而得到去除Si4+之混酸廢液。接著藉由蒸餾去除Si4+之混酸廢液,能夠不餾出Si以外的金屬成分而殘留於蒸餾塔內等,而得到雜質(Si或Si以外的金屬成分等)少之第1餾出液(含有混酸之液體)。然後藉由 蒸餾該第1餾出液,可回收雜質少之氫氟酸濃縮混酸液作為蒸餾殘液,並且回收雜質少之混酸液作為餾出液(第2餾出液)。 The recovery methods described above, can be by adding a salt containing hydrofluoric acid, hydrochloric acid and the mixture of Si 4+ waste generated precipitates containing Si 4+ of, it can be removed by the precipitate obtained by removing Si 4+ Mixed acid waste liquid. Then, by removing the Si 4+ mixed acid waste liquid by distillation, it is possible to obtain a first distillate having few impurities (such as a metal component other than Si or Si) without remaining a metal component other than Si in the distillation column. (Liquid containing mixed acid). Then, by distilling the first distillate, a hydrofluoric acid concentrated mixed acid solution having a small amount of impurities can be recovered as a distillation residue, and a mixed acid solution having a small amount of impurities can be recovered as a distillate (second distillate).

適用上述回收方法之對象的廢液,例如可列舉出: The waste liquid to which the above-mentioned recovery method is applied may, for example, be as follows:

‧含有Si4+、鹽酸及氫氟酸(氟化氫酸)之混酸廢液 ‧ Mixed acid waste liquid containing Si 4+ , hydrochloric acid and hydrofluoric acid (hydrogen fluoride)

‧含有Si4+、硝酸及氫氟酸(氟化氫酸)之混酸廢液等。 ‧ Mixed acid waste liquid containing Si 4+ , nitric acid and hydrofluoric acid (hydrogen fluoride).

前述混酸廢液除了含有鹽酸與氫氟酸之外,更可含有其他酸。從半導體製造工廠所排出之氫氟酸系混酸廢液中,除了溶存作為H2SiF6之Si4+之外,較多是含有Si以外的其他金屬離子。 The mixed acid waste liquid may contain other acids in addition to hydrochloric acid and hydrofluoric acid. In the hydrofluoric acid-based mixed acid waste liquid discharged from the semiconductor manufacturing plant, in addition to the Si 4+ which is H 2 SiF 6 , most of the metal ions other than Si are contained.

前述第1蒸餾步驟中的蒸餾溫度(蒸餾時之混酸廢液的溫度),較佳設定在80℃~130℃的範圍。設為80℃以上時,可提升蒸餾效率,設為130℃以下時,可抑制蒸餾所需之熱能成本。當中,前述第1蒸餾步驟中的蒸餾溫度,尤佳設定在110℃~130℃的範圍,更佳設定在115℃~125℃的範圍。 The distillation temperature in the first distillation step (the temperature of the mixed acid waste liquid at the time of distillation) is preferably set in the range of 80 ° C to 130 ° C. When it is 80 ° C or more, the distillation efficiency can be improved, and when it is 130 ° C or less, the heat energy cost required for distillation can be suppressed. In the above, the distillation temperature in the first distillation step is preferably set in the range of 110 ° C to 130 ° C, more preferably in the range of 115 ° C to 125 ° C.

前述第2蒸餾步驟中的蒸餾溫度(蒸餾時之第1餾出液的溫度),較佳設定在80℃~130℃的範圍。藉由設定在80℃~130℃,可將氫氟酸濃縮混酸液充分地殘留於蒸餾殘液,並且將混酸液充分地餾出作為餾出液(第2餾出液)。再者,可進一步提升作為蒸餾殘液之氫氟酸的濃縮率。當中,前述第2蒸餾步驟中的蒸餾溫度,尤佳設定在110℃~130℃的範圍,更佳設定在115℃~125℃的範圍。 The distillation temperature in the second distillation step (the temperature of the first distillate at the time of distillation) is preferably set in the range of 80 ° C to 130 ° C. By setting the temperature to 80 ° C to 130 ° C, the hydrofluoric acid concentrated mixed acid solution can be sufficiently left in the distillation residue, and the mixed acid solution can be sufficiently distilled off as a distillate (second distillate). Further, the concentration ratio of hydrofluoric acid as a distillation residue can be further increased. In the above, the distillation temperature in the second distillation step is preferably set in the range of 110 ° C to 130 ° C, more preferably in the range of 115 ° C to 125 ° C.

前述去除方法及前述回收方法中,鹽並無特別限定,較佳係使用選自由氟化金屬鹽及氯化金屬鹽所組成之群組之1種或2種以上的鹽。 In the above-mentioned removal method and the above-mentioned recovery method, the salt is not particularly limited, and one or two or more salts selected from the group consisting of a metal fluoride salt and a metal chloride salt are preferably used.

前述氟化金屬鹽並無特別限定,例如可列舉出氟化鉀、氟化鈉、氟化鎂、氟化鋰等。 The metal fluoride salt is not particularly limited, and examples thereof include potassium fluoride, sodium fluoride, magnesium fluoride, and lithium fluoride.

前述氯化金屬鹽並無特別限定,例如可列舉出氯化鉀、氯化鈉等。 The metal chloride salt is not particularly limited, and examples thereof include potassium chloride and sodium chloride.

當中,前述鹽特佳係使用選自由氟化鉀、氟化鈉、氯化鉀、氯化鈉、氟化鎂及氟化鋰所組成之群組之1種或2種以上的鹽。 In particular, the salt is preferably one or more salts selected from the group consisting of potassium fluoride, sodium fluoride, potassium chloride, sodium chloride, magnesium fluoride, and lithium fluoride.

此外,將鹽添加於前述廢液時之添加量,較佳係設定為將鹽添加於前述廢液所成之「添加鹽之廢液」中之鹽的含有比率成為5質量%~10質量%的範圍。當中,前述添加鹽之廢液中之鹽的含有比率,尤佳為5質量%~7質量%的範圍。 In addition, the amount of the salt to be added to the waste liquid is preferably 5% by mass to 10% by mass based on the content of the salt added to the "added salt waste liquid" formed by the waste liquid. The scope. In particular, the content ratio of the salt in the waste liquid to which the salt is added is preferably in the range of 5 mass% to 7 mass%.

上述所得之第2餾出液(混酸回收液),可直接使用或是因應各種用途調整酸的濃度等而使用。此外,上述所得之蒸餾殘液(氫氟酸濃縮混酸回收液),可直接使用或是因應各種用途調整酸的濃度等而使用。 The second distillate (mixed acid recovery liquid) obtained above can be used as it is, or the concentration of the acid can be adjusted depending on various uses. Further, the distillation residue (hydrofluoric acid concentrated mixed acid recovery liquid) obtained above can be used as it is, or the concentration of the acid can be adjusted depending on various uses.

第1圖係顯示本發明之回收方法所使用之回收裝置1的一例。9為混合槽,10為固液分離機,11為第1蒸餾塔,12為第2蒸餾塔。在此係以適用於含有鹽酸及氫氟酸之混酸廢液(雜質至少含有Si4+)者為例來說明。 Fig. 1 is a view showing an example of a recovery device 1 used in the recovery method of the present invention. 9 is a mixing tank, 10 is a solid-liquid separator, 11 is a first distillation column, and 12 is a second distillation column. Here, the description will be made by taking an example of a mixed acid waste liquid containing hydrochloric acid and hydrofluoric acid (the impurity contains at least Si 4+ ).

前述混合槽9具備攪拌葉片。當將前述混酸廢液(含 有氫氟酸、鹽酸及Si4+之混酸廢液)與鹽投入於前述混合槽9後,藉由前述攪拌葉片來攪拌混合而得到混合液。於該混合液中,由於鹽的存在而產生沉澱物(含有Si4+之沉澱物)。 The mixing tank 9 is provided with a stirring blade. When the mixed acid waste liquid (mixed acid waste liquid containing hydrofluoric acid, hydrochloric acid, and Si 4+ ) and the salt are placed in the mixing tank 9, the mixture is stirred and mixed by the stirring blade to obtain a mixed liquid. In the mixed solution, a precipitate (containing a precipitate of Si 4+ ) is generated due to the presence of a salt.

接著將前述混合液投入於固液分離機10,於該固液分離機10中分離為沉澱物與液體(混酸廢液;不含沉澱物)。本實施形態中,係使用離心分離機作為前述固液分離機10,並藉由離心分離法使沉澱物往下沉降而進行固液分離。前述固液分離機10內的濾液(上清液),由於去除沉澱物,所以可降低或去除Si4+Next, the mixed liquid is introduced into the solid-liquid separator 10, and the solid-liquid separator 10 is separated into a precipitate and a liquid (mixed acid waste liquid; no precipitate). In the present embodiment, a centrifugal separator is used as the solid-liquid separator 10, and the precipitate is sedimented downward by centrifugal separation to carry out solid-liquid separation. The filtrate (supernatant) in the solid-liquid separator 10 can reduce or remove Si 4+ by removing precipitates.

接著將前述固液分離機10內的濾液(去除Si4+之混酸廢液)投入於第1蒸餾塔11內,並在第1蒸餾塔11進行蒸餾。藉由該第1蒸餾操作,從第1蒸餾塔11的頂部餾出第1餾出液(含有氫氟酸及鹽酸之混酸液),Si以外的金屬成分殘留於第1蒸餾塔11內。如此可得到雜質(Si或Si以外的金屬成分等)少之第1餾出液。 Then, the filtrate (the mixed acid waste liquid from which Si 4+ is removed) in the solid-liquid separator 10 is introduced into the first distillation column 11 and distilled in the first distillation column 11 . By the first distillation operation, the first distillate (mixed acid solution containing hydrofluoric acid and hydrochloric acid) is distilled off from the top of the first distillation column 11, and the metal component other than Si remains in the first distillation column 11. Thus, the first distillate having few impurities (such as a metal component other than Si or Si) can be obtained.

接著將從第1蒸餾塔11餾出之第1餾出液投入於第2蒸餾塔12,並在第2蒸餾塔12進行蒸餾。藉由該第2蒸餾操作,從第2蒸餾塔12的頂部餾出第2餾出液(混酸液)。如此可回收混酸液。 Then, the first distillate distilled from the first distillation column 11 is introduced into the second distillation column 12, and is distilled in the second distillation column 12. The second distillate (mixed acid solution) is distilled off from the top of the second distillation column 12 by the second distillation operation. The acid mixture can be recovered in this way.

在前述第2蒸餾操作後,於前述第2蒸餾塔12的內部,得到作為蒸餾殘液之氫氟酸濃縮混酸液。如此可回收含有濃縮氫氟酸之液體(氫氟酸濃縮回收液)。 After the second distillation operation, a hydrofluoric acid concentrated mixed acid solution as a distillation residue is obtained inside the second distillation column 12. Thus, the liquid containing concentrated hydrofluoric acid (hydrofluoric acid concentrated recovery liquid) can be recovered.

鹽對於前述混合槽9之投入,較佳於裝置1中具備如 第2圖般之鹽自動添加系統來進行。第2圖中,21為廢液槽,22為泵,23為固體成分去除裝置,24為污泥槽,25為質量流量計,26為計算機,27為計量器,28為鹽槽,29為泵。 The input of the salt to the mixing tank 9 is preferably provided in the apparatus 1 as The salt is automatically added to the system as shown in Fig. 2. In Fig. 2, 21 is the waste liquid tank, 22 is the pump, 23 is the solid component removal device, 24 is the sludge tank, 25 is the mass flow meter, 26 is the computer, 27 is the meter, 28 is the salt tank, 29 is Pump.

從前述廢液槽21朝輸送液的下游側,經由供給管31依序連接有泵22、固體成分去除裝置23、質量流量計25、切換閥51、混合槽9(參考第2圖)。此外,前述混合槽9經由泵29連接於前述固液分離機10(參考第2圖)。前述質量流量計25,係設置在將前述廢液供給至前述混合槽9之供給管31。 The pump 22, the solid component removing device 23, the mass flow meter 25, the switching valve 51, and the mixing tank 9 are sequentially connected to the downstream side of the transport liquid from the waste liquid tank 21 via the supply pipe 31 (refer to Fig. 2). Further, the mixing tank 9 is connected to the solid-liquid separator 10 via a pump 29 (refer to Fig. 2). The mass flow meter 25 is provided in a supply pipe 31 that supplies the waste liquid to the mixing tank 9.

前述質量流量計25,係測定通過前述供給管31之廢液的流量及密度,該資料(流量及密度)被傳送至前述計算機26。該計算機26中,係從前述資料(流量及密度)計算出通過之廢液中的Si質量。在此顯示計算手法的一例,前述廢液中之「扣除Si之液體」的密度為1.0g/cm3,Si的密度為2.33g/cm3,從此等數值中測定廢液的密度,如此可求取廢液中的Si含有率,從該Si含有率及前述流量的測定值,可計算出Si質量(亦即投入於混合槽9之Si質量)。從半導體製造工廠等所排出之氫氟酸系混酸廢液、氫氟酸系廢液中,較多亦含有Si以外的金屬成分,但該含量為極少之水準,在前述密度的評估中可忽視此等「Si以外的金屬成分」來計算(即使忽視來計算,對於鹽自動添加系統的精度不會有影響)。 The mass flow meter 25 measures the flow rate and density of the waste liquid passing through the supply pipe 31, and the data (flow rate and density) is transmitted to the computer 26. In the computer 26, the mass of Si in the used waste liquid is calculated from the above data (flow rate and density). Here, an example of the calculation method is shown in which the density of the "liquid from which Si is deducted" in the waste liquid is 1.0 g/cm 3 and the density of Si is 2.33 g/cm 3 , and the density of the waste liquid is measured from these values. The Si content in the waste liquid is obtained, and the Si mass (that is, the mass of Si applied to the mixing tank 9) can be calculated from the Si content and the measured value of the flow rate. In the hydrofluoric acid-based mixed acid waste liquid and the hydrofluoric acid-based waste liquid discharged from a semiconductor manufacturing plant, many metal components other than Si are contained, but the content is extremely small, and can be ignored in the evaluation of the density. These "metal components other than Si" are calculated (even if they are ignored, the accuracy of the salt automatic addition system will not be affected).

再者,前述計算機26中,根據前述計算出之「Si的 通過質量」來計算「Si的沉澱化所需之鹽的質量」,該計算值被傳送至前述計量器27。例如,當使用KF(氟化鉀)作為鹽時,由於沉澱反應式為:2KF+H2SiF6→K2SiF6+2HF Further, in the computer 26, "the mass of the salt required for the precipitation of Si" is calculated based on the "passing quality of Si" calculated above, and the calculated value is transmitted to the meter 27. For example, when KF (potassium fluoride) is used as the salt, the precipitation reaction formula is: 2KF+H 2 SiF 6 →K 2 SiF 6 +2HF

故可根據此來計算Si的沉澱化(生成不溶解於水之K2SiF6)所需之鹽的質量(相對於1當量的Si,需有2當量的KF)。 Therefore, the mass of the salt required for the precipitation of Si (the formation of K 2 SiF 6 which is insoluble in water) can be calculated from this (2 equivalents of KF is required with respect to 1 equivalent of Si).

當使用NaCl(氯化鈉)作為鹽時,沉澱反應式為:2NaCl+H2SiF6→Na2SiF6+2HCl When NaCl (sodium chloride) is used as the salt, the precipitation reaction formula is: 2NaCl+H 2 SiF 6 →Na 2 SiF 6 +2HCl

而生成不溶解於水之Na2SiF6Na 2 SiF 6 which does not dissolve in water is formed.

此外,當使用KCl(氯化鉀)作為鹽時,沉澱反應式為:2KCl+H2SiF6→K2SiF6+2HCl In addition, when KCl (potassium chloride) is used as the salt, the precipitation reaction formula is: 2KCl + H 2 SiF 6 → K 2 SiF 6 + 2HCl

而生成不溶解於水之K2SiF6It produces K 2 SiF 6 which is insoluble in water.

當使用NaF(氟化鈉)作為鹽時,沉澱反應式為:2NaF+H2SiF6→Na2SiF6+2HF When NaF (sodium fluoride) is used as the salt, the precipitation reaction formula is: 2NaF+H 2 SiF 6 →Na 2 SiF 6 +2HF

而生成不溶解於水之Na2SiF6Na 2 SiF 6 which does not dissolve in water is formed.

前述計量器27,從鹽槽28計量出既定量(前述計算值的質量)的鹽,並送入至前述混合槽9。 The meter 27 measures a salt having a predetermined amount (mass of the above calculated value) from the salt tank 28, and feeds it to the mixing tank 9.

本實施形態中,係採用科氏(Coriolis)型式者作為前述質量流量計25,採用減重方式者作為前述計量器27,但並無特別限定。前述質量流量計25,較佳係採用耐酸性材質之科氏型式者。 In the present embodiment, a Coriolis type is used as the mass flow meter 25, and a weight reduction method is used as the gauge 27, but it is not particularly limited. The mass flow meter 25 is preferably a Coriolis type which is made of an acid resistant material.

將前述混酸廢液(含有氫氟酸、鹽酸及Si4+之混酸廢液)貯留於前述廢液槽21。藉由泵22使該廢液槽21內的混酸廢液通過前述固體成分去除裝置23後,通過前述質量流量計25並投入於前述混合槽9內。本實施形態中,前述固體成分去除裝置23係使用液體渦旋機,於通過該液體渦旋機時,廢液中的固體成分(雜質、污泥等)沉降而被去除。沉降去除後之固體成分,藉由閥30的開閉被適當地輸送至污泥槽24。 The mixed acid waste liquid (mixed acid waste liquid containing hydrofluoric acid, hydrochloric acid, and Si 4+ ) is stored in the waste liquid tank 21 described above. The mixed acid waste liquid in the waste liquid tank 21 is passed through the solid component removing device 23 by the pump 22, and then introduced into the mixing tank 9 through the mass flow meter 25. In the present embodiment, the solid component removing device 23 uses a liquid scroll machine, and when passing through the liquid scroll machine, solid components (impurities, sludge, and the like) in the waste liquid are sedimented and removed. The solid component after the sedimentation removal is appropriately transported to the sludge tank 24 by opening and closing of the valve 30.

於前述質量流量計25中,測量通過前述供給管31之廢液的流量及密度,該資料(流量及密度)被傳送至前述計算機26(測量步驟)。 In the mass flow meter 25 described above, the flow rate and density of the waste liquid passing through the supply pipe 31 are measured, and the data (flow rate and density) are transmitted to the aforementioned computer 26 (measurement step).

於前述計算機26中,係從前述質量流量計25所傳來之資料(流量及密度),計算「通過之廢液中的Si質量」,並根據該計算值計算「Si的沉澱化所需之鹽的質量」,該計算值(Si的沉澱化所需之鹽的質量)被傳送至前述計量器27(計算步驟)。 In the computer 26, the data (flow rate and density) transmitted from the mass flow meter 25 is used to calculate the "mass of Si in the waste liquid passed through", and the "precipitation of Si" is calculated based on the calculated value. The mass of the salt, the calculated value (the mass of the salt required for the precipitation of Si) is sent to the aforementioned meter 27 (calculation step).

然後藉由前述計量器27,從鹽槽28計量出既定量(計算值的質量份),並送入至前述混合槽9(計量步驟)。 Then, by the above-described meter 27, the predetermined amount (mass of the calculated value) is measured from the salt tank 28, and is sent to the mixing tank 9 (measurement step).

藉由在裝置1中設置如第2圖所示之構成的鹽自動添加系統,可精度高且自動地將Si的沉澱化所需之量的鹽添加於混合槽9。前述鹽自動添加系統,不論是廢液的輸送為分批方式或連續方式均可對應。 By providing the salt automatic addition system having the configuration shown in FIG. 2 in the apparatus 1, it is possible to add the salt required for the precipitation of Si to the mixing tank 9 with high precision and automatically. The salt automatic addition system described above can be used in either a batch mode or a continuous mode.

前述實施形態中,係採用在前述供給管31中之前述 混合槽9與前述質量流量計25之間配置切換閥51,並且循環管50的一端連接於前述切換閥51,前述循環管50的另一端連接於前述廢液槽21之構成,所以可藉由切換閥51的切換,將在前述固體成分去除裝置23所分離之液體,經由廢液槽21、泵22再供給至該固體成分去除裝置23內1至複數次,進行複數次固體成分去除處理以盡可能降低固體成分量(將固體成分量降低至期望的密度)後,再投入於前述混合槽9(參考第2圖)。 In the above embodiment, the foregoing in the supply pipe 31 is employed. The switching valve 51 is disposed between the mixing tank 9 and the mass flow meter 25, and one end of the circulation pipe 50 is connected to the switching valve 51, and the other end of the circulation pipe 50 is connected to the waste liquid tank 21, so that it can be When the switching valve 51 is switched, the liquid separated by the solid component removing device 23 is supplied to the solid component removing device 23 through the waste liquid tank 21 and the pump 22 1 to a plurality of times, and the solid component removing process is performed a plurality of times. The solid content is reduced as much as possible (the solid content is reduced to a desired density), and then introduced into the mixing tank 9 (refer to Fig. 2).

本發明之去除方法及回收方法,亦可使用第3圖~第5圖所示之構成的回收裝置來實施。第3圖所示之回收裝置1中,與第1圖所示之回收裝置1相比,不同點為下列構成。 The removal method and the recovery method of the present invention can also be carried out using a recovery apparatus having the configuration shown in Figs. 3 to 5 . The recovery device 1 shown in Fig. 3 differs from the recovery device 1 shown in Fig. 1 in the following configuration.

1)並非將前述混酸廢液直接投入於混合槽9,而是將在後述固液分離裝置(固液分離系統)100A中對前述混酸廢液進行前處理以去除固體成分(雜質等)後之混酸廢液投入於混合槽9。 1) The above-mentioned mixed acid waste liquid is not directly introduced into the mixing tank 9, but the solid acid liquid waste liquid (the solid-liquid separation system) 100A described later is subjected to pretreatment of the mixed acid waste liquid to remove solid components (impurities, etc.). The mixed acid waste liquid is supplied to the mixing tank 9.

2)配置在混合槽9與第1蒸餾塔11之間之固液分離機,係使用後述固液分離裝置(固液分離系統)100B來取代前述固液分離機10。 2) The solid-liquid separator disposed between the mixing tank 9 and the first distillation column 11 is replaced by the solid-liquid separator (solid-liquid separation system) 100B described later.

第4圖係顯示第3圖所示之回收裝置1中之包含上述2個固液分離裝置(固液分離系統)100A、100B之前半構成部的詳細構成。 Fig. 4 is a view showing the detailed configuration of the first half of the constituent components of the above-described two solid-liquid separation devices (solid-liquid separation systems) 100A and 100B in the recovery device 1 shown in Fig. 3.

第4圖中,41為廢液槽,42為泵,43為固液分離機,44為污泥罐,45為排出管,46為排出閥,47為界面 位置檢測器,48為控制部,49為污泥槽。前述固液分離裝置(固液分離系統)100A,具備固液分離機43,污泥罐44,排出管45,排出閥46,界面位置檢測器47,控制部48而成。 In Fig. 4, 41 is a waste liquid tank, 42 is a pump, 43 is a solid-liquid separator, 44 is a sludge tank, 45 is a discharge pipe, 46 is a discharge valve, and 47 is an interface. The position detector 48 is a control unit and 49 is a sludge tank. The solid-liquid separation device (solid-liquid separation system) 100A includes a solid-liquid separator 43, a sludge tank 44, a discharge pipe 45, a discharge valve 46, an interface position detector 47, and a control unit 48.

此外,第4圖中,62為泵,63為固液分離機,64為污泥罐,65為排出管,66為排出閥,67為界面位置檢測器,68為控制部,69為污泥槽。前述固液分離裝置(固液分離系統)100B,具備固液分離機63,污泥罐64,排出管65,排出閥66,界面位置檢測器67,控制部68而成。 In addition, in Fig. 4, 62 is a pump, 63 is a solid-liquid separator, 64 is a sludge tank, 65 is a discharge pipe, 66 is a discharge valve, 67 is an interface position detector, 68 is a control part, and 69 is a sludge. groove. The solid-liquid separation device (solid-liquid separation system) 100B includes a solid-liquid separator 63, a sludge tank 64, a discharge pipe 65, a discharge valve 66, an interface position detector 67, and a control unit 68.

第4圖中,質量流量計25、計算機26、計量器27、鹽槽28、供給管31的各構成、各功能、連接型態等,與第2圖相同,在此省略此等的重複說明。此外,第3圖中之混合槽9與第1蒸餾塔11之後的下游側之構成部的各構成、各功能、連接型態等,與第1圖相同,在此省略此等的重複說明。 In Fig. 4, the respective configurations, functions, connection types, and the like of the mass flow meter 25, the computer 26, the gauge 27, the salt tank 28, and the supply tube 31 are the same as those in Fig. 2, and the repeated description thereof will be omitted here. . In addition, the respective configurations, functions, connection types, and the like of the components on the downstream side after the first mixing column 11 and the first distillation column 11 in the third embodiment are the same as those in the first embodiment, and the repeated description thereof will be omitted.

以下說明前述固液分離裝置(固液分離系統)100A及前述固液分離裝置(固液分離系統)100B等。 Hereinafter, the above-described solid-liquid separation device (solid-liquid separation system) 100A, the above-described solid-liquid separation device (solid-liquid separation system) 100B, and the like will be described.

從前述廢液槽41朝輸送液的下游側,經由供給管40依序連接有泵42、固體分離裝置(固液分離系統)100A(參考第4圖)。從前述固液分離裝置100A中進行固液分離處理後被送出之液體(雜質等固體成分被去除後之混酸廢液),係經由在中途位置設置有質量流量計25之供給管31被輸送至混合槽9。 A pump 42 and a solid separation device (solid-liquid separation system) 100A are connected to the downstream side of the transfer liquid from the waste liquid tank 41 via the supply pipe 40 (refer to FIG. 4). The liquid (the mixed acid waste liquid from which solid components such as impurities are removed) after being subjected to the solid-liquid separation treatment in the solid-liquid separation device 100A is transported to the supply pipe 31 provided with the mass flow meter 25 at a midway position. Mixing tank 9.

本實施形態中,前述固液分離機43係使用液體渦旋機。此外,一端連接於前述廢液槽41的底部之供給管40的另一端,水平地連接於前述液體渦旋機43的上部位置。前述液體渦旋機43,可利用離心力來分離懸浮於液體中之固體成分(固體)與液體。當將混酸廢液往水平方向投入於前述液體渦旋機43時,沿著液體渦旋機43之周壁部的傾斜面產生螺旋狀下降流,固體(雜質等)由該螺旋狀下降流所帶動,被導往液體渦旋機的底部而排出,並被輸送至前述污泥罐44。另一方面,在液體渦旋機43的中心部,相反地產生上升流,使液體(混酸廢液)由該上升流所帶動,從液體渦旋機43的上部吐出,並經由前述供給管31被輸送至前述混合槽9。前述液體渦旋機43,可使用耐酸性的材料(例如聚氯乙烯等)來構成耐酸性的裝置,且容易製作。 In the present embodiment, the solid-liquid separator 43 is a liquid scroll. Further, the other end of the supply pipe 40, which is connected to the bottom of the waste liquid tank 41 at one end, is horizontally connected to the upper position of the liquid scroll 43. The liquid scroll machine 43 can separate a solid component (solid) suspended in a liquid from a liquid by centrifugal force. When the mixed acid waste liquid is supplied to the liquid scroll machine 43 in the horizontal direction, a spiral downward flow is generated along the inclined surface of the peripheral wall portion of the liquid scroll 43, and solids (impurities, etc.) are driven by the spiral downward flow. It is discharged to the bottom of the liquid scroll and discharged to the sludge tank 44. On the other hand, in the center portion of the liquid scroll 43, an upward flow is generated in reverse, and the liquid (mixed acid waste liquid) is driven by the upward flow, and is discharged from the upper portion of the liquid scroll 43 and passed through the supply pipe 31. It is sent to the aforementioned mixing tank 9. The liquid scroll 43 can be made of an acid-resistant material (for example, polyvinyl chloride or the like) to form an acid-resistant device, and can be easily produced.

於前述液體渦旋機43的底部配置有污泥罐44。前述液體渦旋機43之底部的排出口與前述污泥罐44之上部的導入口53相連通而連接。排出管45的一端連接於前述污泥罐44之底部的排出口52,排出管45的另一端連接於前述污泥槽49的上部開口部,於前述排出管45的中途安裝有排出閥46。 A sludge tank 44 is disposed at the bottom of the liquid scroll 43. The discharge port at the bottom of the liquid scroll unit 43 is connected to and connected to the introduction port 53 at the upper portion of the sludge tank 44. One end of the discharge pipe 45 is connected to the discharge port 52 at the bottom of the sludge tank 44, and the other end of the discharge pipe 45 is connected to the upper opening of the sludge tank 49, and a discharge valve 46 is attached to the middle of the discharge pipe 45.

此外,於前述污泥罐44的上部安裝有界面位置檢測器47(參考第5圖)。本實施形態中,前述界面位置檢測器47使用超音波界面檢測器。此外,於前述污泥罐44的上壁(本實施形態中為上壁中之外周緣部的一部分), 形成有貫通上下方向之超音波通過路徑54,並以可經由該超音波通過路徑54將超音波發送至污泥罐44的內部空間之方式,將前述超音波界面檢測器47安裝在前述污泥罐44的上部。藉由該超音波界面檢測器47,可檢測出被容納於前述污泥罐44的內部之固體成分的上面位置。前述超音波界面檢測器47並無特別限定,例如可使用堀場製作所股份有限公司製的「超音波型式界面計SL-200A」、山本電機工業公司製的「超音波型式液位計YU-L20型」等。前述超音波界面檢測器47較佳係由具有耐蝕性之材料所形成。 Further, an interface position detector 47 is attached to the upper portion of the sludge tank 44 (refer to Fig. 5). In the present embodiment, the interface position detector 47 uses an ultrasonic interface detector. Further, in the upper wall of the sludge tank 44 (in the present embodiment, a part of the outer peripheral portion of the upper wall), The ultrasonic wave passage 54 that penetrates the vertical direction is formed, and the ultrasonic interface detector 47 is attached to the sludge so that ultrasonic waves can be transmitted to the internal space of the sludge tank 44 via the ultrasonic passage path 54. The upper portion of the tank 44. The ultrasonic interface detector 47 can detect the upper position of the solid content contained in the inside of the sludge tank 44. The ultrasonic interface detector 47 is not particularly limited, and for example, an "ultrasonic type interface meter SL-200A" manufactured by Horiba, Ltd., and an ultrasonic type liquid level gauge YU-L20 manufactured by Yamamoto Electric Co., Ltd. "Wait. The aforementioned ultrasonic interface detector 47 is preferably formed of a material having corrosion resistance.

前述控制部48,係根據前述界面位置檢測器47所檢測之固體成分之上面位置的資料,進行前述排出閥46的開閉操作或開度調整。 The control unit 48 performs an opening/closing operation or an opening degree adjustment of the discharge valve 46 based on the information on the upper position of the solid component detected by the interface position detector 47.

本實施形態中,前述控制部48,係以當前述界面位置檢測器47所檢測之固體成分的上面位置上升至前述污泥罐44內的第1既定高度81時,開啟排出閥46以排出污泥罐44內的固體成分,並且當由於前述固體成分的排出使前述界面位置檢測器47所檢測之固體成分的上面位置下降至污泥罐44內的第2既定高度82時,關閉排出閥46之方式進行控制(參考第5圖)。前述第1既定高度81位於較前述第2既定高度82更高之位置(參考第5圖)。 In the present embodiment, when the upper position of the solid component detected by the interface position detector 47 rises to the first predetermined height 81 in the sludge tank 44, the control unit 48 opens the discharge valve 46 to discharge the dirt. The solid component in the clay tank 44, and when the upper position of the solid component detected by the interface position detector 47 is lowered to the second predetermined height 82 in the sludge tank 44 due to the discharge of the solid component, the discharge valve 46 is closed. The way to control (refer to Figure 5). The first predetermined height 81 is located higher than the second predetermined height 82 (refer to FIG. 5).

前述污泥罐44,係用以暫時容納從前述液體渦旋機43之底部的排出口所排出之固體成分(雜質等;亦包含 一部分液體),藉由設置該污泥罐44,可降低排出至前述污泥槽49之固體成分中的液體混入率。因此,可提升經由蒸餾操作所最終回收之回收液(混酸回收液、氫氟酸濃縮混酸回收液等)的回收率。 The sludge tank 44 is for temporarily accommodating solid components (impurities, etc.) discharged from the discharge port at the bottom of the liquid scroll 43; In a part of the liquid), by providing the sludge tank 44, the liquid mixing rate discharged into the solid content of the sludge tank 49 can be reduced. Therefore, the recovery rate of the recovered liquid (mixed acid recovery liquid, hydrofluoric acid concentrated mixed acid recovery liquid, etc.) finally recovered by the distillation operation can be improved.

接著,從前述液體渦旋機43吐出並經由供給管31被輸送至前述混合槽9之混酸廢液(雜質等被去除者),在該混合槽9中與鹽攪拌混合而形成混合液。於該混合液中,由於鹽的添加而產生沉澱物(固體成分;含有Si4+之沉澱物)。 Then, the mixed acid waste liquid (the impurities or the like which are removed) is discharged from the liquid scroll unit 43 and sent to the mixing tank 9 via the supply pipe 31, and the mixed tank 9 is stirred and mixed with the salt to form a mixed liquid. In the mixed solution, a precipitate (solid content; precipitate containing Si 4+ ) was generated due to the addition of salt.

從該混合槽9朝輸送液的下游側,經由供給管60依序連接有泵62、固體分離裝置(固液分離系統)100B(參考第4圖)。從前述固液分離裝置100B中進行固液分離處理後被送出之液體(Si4+被去除後之混酸廢液),係經由供給管61被輸送至第1蒸餾塔11。從第1蒸餾塔11開始之處理內容等,與前述實施形態(第1圖之回收裝置)相同。 From the mixing tank 9 to the downstream side of the transport liquid, a pump 62 and a solid separation device (solid-liquid separation system) 100B are sequentially connected via a supply pipe 60 (refer to Fig. 4). The liquid (the mixed acid waste liquid from which Si 4+ is removed) which is sent out after the solid-liquid separation treatment in the solid-liquid separation device 100B is sent to the first distillation column 11 via the supply pipe 61. The content of the treatment from the first distillation column 11 and the like are the same as those of the above-described embodiment (the recovery apparatus of Fig. 1).

本實施形態中,前述固液分離機63係使用液體渦旋機。此外,一端連接於前述混合槽9的底部之供給管60的另一端,水平地連接於前述液體渦旋機63的上部位置。前述液體渦旋機63,可利用離心力來分離懸浮於液體中之固體成分(固體)與液體。當將混酸廢液(雜質等被去除後之混酸廢液)往水平方向投入於前述液體渦旋機63時,沿著液體渦旋機63之周壁部的傾斜面產生螺旋狀下降流,固體(Si4+系沉澱物)由該螺旋狀下降流所帶 動,被導往液體渦旋機的底部而排出,並被輸送至前述污泥罐64。另一方面,在液體渦旋機63的中心部,相反地產生上升流,使液體(Si4+被去除後之混酸廢液)由該上升流所帶動,從液體渦旋機63的上部吐出,並經由前述供給管61被輸送至第1蒸餾塔11。 In the present embodiment, the solid-liquid separator 63 is a liquid scroll machine. Further, the other end of the supply pipe 60, which is connected at one end to the bottom of the mixing tank 9, is horizontally connected to the upper position of the liquid scroll 63. The liquid scroll 63 can separate solid components (solids) and liquid suspended in the liquid by centrifugal force. When the mixed acid waste liquid (mixed acid waste liquid from which impurities or the like are removed) is horizontally introduced into the liquid scroll 63, a spiral downward flow is generated along the inclined surface of the peripheral wall portion of the liquid scroll 63, and the solid ( The Si 4+ precipitate is driven by the spiral downward flow, is discharged to the bottom of the liquid scroll, and is discharged to the sludge tank 64. On the other hand, in the center portion of the liquid scroll 63, an upward flow is generated in the opposite direction, and the liquid (the mixed acid waste liquid after the Si 4+ is removed) is driven by the upward flow, and is discharged from the upper portion of the liquid scroll 63. And it is sent to the 1st distillation tower 11 via the said supply pipe 61.

於前述供給管61的中途設置有質量流量計70(參考第4圖)。為了減少往前述第1蒸餾塔11被輸送之沉澱物(固體成分)的量,亦可採用:設置使前述供給管61再循環至混合槽9之路徑(圖中未顯示),並藉由前述質量流量計70的監視,至降低至期望密度(固體成分量)後再輸送至前述第1蒸餾塔11之方法。 A mass flow meter 70 is provided in the middle of the supply pipe 61 (refer to Fig. 4). In order to reduce the amount of the precipitate (solid content) transported to the first distillation column 11, it is also possible to provide a path (not shown) for recycling the supply pipe 61 to the mixing tank 9, and by the foregoing The monitoring of the mass flow meter 70 is carried out until the desired density (solid content) is transferred to the first distillation column 11.

於前述液體渦旋機63的底部配置有污泥罐64。前述液體渦旋機63之底部的排出口與前述污泥罐64之上部的導入口73相連通而連接。排出管65的一端連接於前述污泥罐64之底部的排出口72,排出管65的另一端連接於前述污泥槽69的上部開口部,於前述排出管65的中途安裝有排出閥66。 A sludge tank 64 is disposed at the bottom of the liquid scroll 63. The discharge port at the bottom of the liquid scroll 63 is connected to and connected to the inlet 73 of the upper portion of the sludge tank 64. One end of the discharge pipe 65 is connected to the discharge port 72 at the bottom of the sludge tank 64, and the other end of the discharge pipe 65 is connected to the upper opening of the sludge tank 69, and a discharge valve 66 is attached to the middle of the discharge pipe 65.

此外,於前述污泥罐64的上部安裝有界面位置檢測器67(參考第5圖)。本實施形態中,前述界面位置檢測器67使用超音波界面檢測器。此外,於前述污泥罐64的上壁(本實施形態中為上壁中之外周緣部的一部分),形成有貫通上下方向之超音波通過路徑74,並以可經由該超音波通過路徑74將超音波發送至污泥罐64的內部空間之方式,將前述超音波界面檢測器67安裝在前述污泥 罐64的上部。藉由該超音波界面檢測器67,可檢測出被容納於前述污泥罐64的內部之固體成分(Si4+系沉澱固體成分)的上面位置。前述超音波界面檢測器67並無特別限定,例如可使用堀場製作所股份有限公司製的「超音波型式界面計SL-200A」、山本電機工業公司製的「超音波型式液位計YU-L20型」等。前述超音波界面檢測器67較佳係由具有耐蝕性之材料所形成。 Further, an interface position detector 67 is attached to the upper portion of the sludge tank 64 (refer to Fig. 5). In the present embodiment, the interface position detector 67 uses an ultrasonic interface detector. Further, in the upper wall of the sludge tank 64 (in the present embodiment, a part of the outer peripheral portion of the upper wall), an ultrasonic passage path 74 that penetrates the vertical direction is formed, and the ultrasonic passage path 74 is provided through the ultrasonic wave. The ultrasonic interface detector 67 is attached to the upper portion of the sludge tank 64 so that the ultrasonic wave is transmitted to the internal space of the sludge tank 64. The ultrasonic interface detector 67 can detect the upper position of the solid component (Si 4+ -based precipitated solid component) contained in the sludge tank 64. The ultrasonic interface detector 67 is not particularly limited, and for example, "Ultra-wave type interface meter SL-200A" manufactured by Horiba, Ltd., and "Ultra-wave type liquid level gauge YU-L20" manufactured by Yamamoto Denki Kogyo Co., Ltd. "Wait. The aforementioned ultrasonic interface detector 67 is preferably formed of a material having corrosion resistance.

本實施形態中,前述界面位置檢測器47、67係使用超音波型式,但例如亦可使用光學型式。惟光學型式者,對於沉降速度慢的固體成分而言,其檢測較慢。前述光學型式的界面位置檢測器,較佳亦由具有耐酸性之材料所形成。前述光學型式的界面位置檢測器並無特別限定,例如可使用Nohken股份有限公司製的「光學型式界面計OX100型」等。 In the present embodiment, the interface position detectors 47 and 67 are of an ultrasonic type, but an optical type may be used, for example. However, for optical types, the detection of slower solid components is slower. The optical position interface position detector described above is preferably also formed of a material having acid resistance. The interface position detector of the optical type is not particularly limited, and for example, an "optical type interface meter OX100 type" manufactured by Nohken Co., Ltd. or the like can be used.

前述控制部68,係根據前述界面位置檢測器67所檢測之固體成分(Si4+系沉澱固體成分)之上面位置的資料,進行前述排出閥66的開閉操作或開度調整。 The control unit 68 performs an opening/closing operation or an opening degree adjustment of the discharge valve 66 based on the information on the upper position of the solid component (Si 4+ -based solid content) detected by the interface position detector 67.

本實施形態中,前述控制部68,係以當前述界面位置檢測器67所檢測之沉澱物的上面位置從特定位置83下降時,減少前述排出閥66的開放度,當前述界面位置檢測器67所檢測之沉澱物的上面位置從特定位置83上升時,增大前述排出閥66的開放度之方式進行控制,藉此將前述污泥罐64內之沉澱物的上面位置控制在大致一定的位置83(參考第5圖)。 In the present embodiment, the control unit 68 reduces the degree of opening of the discharge valve 66 when the upper position of the sediment detected by the interface position detector 67 is lowered from the specific position 83, and the interface position detector 67 is used. When the upper position of the detected precipitate rises from the specific position 83, the opening degree of the discharge valve 66 is increased to control the upper position of the sediment in the sludge tank 64 to a substantially constant position. 83 (refer to Figure 5).

前述污泥罐64,係用以暫時容納從前述液體渦旋機63之底部的排出口所排出之固體成分(Si4+系沉澱固體成分;亦包含一部分液體),藉由設置該污泥罐64,可降低排出至前述污泥槽69之沉澱固體成分中的液體混入率。因此,可提升經由蒸餾操作所最終回收之回收液(混酸回收液、氫氟酸濃縮混酸回收液等)的回收率。 The sludge tank 64 is configured to temporarily accommodate a solid component (Si 4+ precipitated solid component; also including a part of liquid) discharged from a discharge port at the bottom of the liquid scroll 63, by providing the sludge tank 64. The liquid mixing ratio of the precipitated solid components discharged to the sludge tank 69 can be reduced. Therefore, the recovery rate of the recovered liquid (mixed acid recovery liquid, hydrofluoric acid concentrated mixed acid recovery liquid, etc.) finally recovered by the distillation operation can be improved.

本發明之去除方法及回收方法,並不特別限定於由第1圖~第5圖所示之構成的回收裝置所進行者。 The removal method and the recovery method of the present invention are not particularly limited to those carried out by the recovery apparatus having the configuration shown in Figs. 1 to 5 .

實施例 Example

接著說明本發明之具體實施例,但本發明並不特別限定於此等實施例。 Next, specific embodiments of the present invention will be described, but the present invention is not particularly limited to the embodiments.

〈實施例1〉 <Example 1>

對於從半導體製造工廠排出之混酸廢液(含有氫氟酸、鹽酸及Si4+之混酸廢液),使用第1圖所示之構成的回收裝置1,如以下所述地實施Si4+去除步驟、第1蒸餾步驟、第2蒸餾步驟。 For the mixed acid waste liquid (mixed acid waste liquid containing hydrofluoric acid, hydrochloric acid, and Si 4+ ) discharged from a semiconductor manufacturing plant, the recovery apparatus 1 having the configuration shown in Fig. 1 is used, and Si 4+ removal is performed as described below. Step, first distillation step, and second distillation step.

(Si4+去除步驟) (Si 4+ removal step)

將前述混酸廢液(含有成分及各成分的含有率如第1表所示)300g及氯化鈉25g投入於混合槽9後,藉由攪拌葉片攪拌混合24小時而得到混合液。 300 g of the mixed acid waste liquid (containing the components and the content of each component as shown in Table 1) and 25 g of sodium chloride were placed in the mixing tank 9, and the mixture was stirred and mixed for 24 hours by a stirring blade to obtain a mixed liquid.

接著將前述混合液投入於離心分離機(固液分離機) 10以進行離心分離,將混合液分離為沉澱物(含有Si4+)與上清液(去除Si4+之混酸廢液;不含沉澱物)。所得之沉澱物為66g,所得之上清液為258g。 Next, the mixed liquid is placed in a centrifugal separator (solid-liquid separator) 10 to carry out centrifugation, and the mixed liquid is separated into a precipitate (containing Si 4+ ) and a supernatant liquid (the mixed acid waste liquid from which Si 4+ is removed; Containing sediment). The obtained precipitate was 66 g, and the obtained supernatant was 258 g.

從XRD(X射線分光分析)的分析結果中,可確認到沉澱物的主成分為矽氟化鈉(Na2SiF6)。 From the analysis results of XRD (X-ray spectroscopic analysis), it was confirmed that the main component of the precipitate was sodium bismuth fluoride (Na 2 SiF 6 ).

(第1蒸餾步驟) (first distillation step)

將前述固液分離機10內的上清液(去除Si4+之混酸廢液)255g投入於第1蒸餾塔11內,並以蒸餾溫度120℃進行蒸餾。藉由該第1蒸餾操作,從第1蒸餾塔11的頂部餾出220g的第1餾出液(含有氫氟酸及鹽酸之混酸液)。 255 g of the supernatant (the mixed acid waste liquid from which Si 4+ was removed) in the solid-liquid separator 10 was placed in the first distillation column 11 and distilled at a distillation temperature of 120 °C. By the first distillation operation, 220 g of the first distillate (containing a mixed acid solution of hydrofluoric acid and hydrochloric acid) was distilled off from the top of the first distillation column 11.

(第2蒸餾步驟) (Second distillation step)

接著將從前述第1蒸餾塔11餾出之第1餾出液的一部分209g投入於第2蒸餾塔12內,並以蒸餾溫度120℃進行蒸餾。藉由該第2蒸餾操作,從第2蒸餾塔12的頂部餾出第2餾出液(混酸液),藉此回收含有混酸之液體116g。在前述第2蒸餾操作後,於第2蒸餾塔12的內部,可回收作為蒸餾殘液之氫氟酸濃縮混酸液(含有濃縮氫氟酸之回收液)92g。 Then, a part of 209 g of the first distillate distilled from the first distillation column 11 was placed in the second distillation column 12, and distillation was carried out at a distillation temperature of 120 °C. By the second distillation operation, the second distillate (mixed acid solution) is distilled off from the top of the second distillation column 12, whereby 116 g of the liquid containing the mixed acid is recovered. After the second distillation operation, 92 g of a hydrofluoric acid concentrated mixed acid solution (recovered liquid containing concentrated hydrofluoric acid) as a distillation residue can be recovered in the second distillation column 12.

〈實施例2〉 <Example 2>

對於從半導體製造工廠排出之混酸廢液(含有氫氟 酸、鹽酸及Si4+之混酸廢液),使用第1圖所示之構成的回收裝置1,如以下所述地實施Si4+去除步驟、第1蒸餾步驟、第2蒸餾步驟。 For the mixed acid waste liquid (mixed acid waste liquid containing hydrofluoric acid, hydrochloric acid, and Si 4+ ) discharged from a semiconductor manufacturing plant, the recovery apparatus 1 having the configuration shown in Fig. 1 is used, and Si 4+ removal is performed as described below. Step, first distillation step, and second distillation step.

(Si4+去除步驟) (Si 4+ removal step)

將前述混酸廢液(含有成分及各成分的含有率如第2表所示)300g及氟化鉀25g投入於混合槽9後,藉由攪拌葉片攪拌混合24小時而得到混合液。 300 g of the mixed acid waste liquid (containing the components and the content of each component as shown in Table 2) and 25 g of potassium fluoride were placed in the mixing tank 9, and the mixture was stirred and mixed for 24 hours by a stirring blade to obtain a mixed liquid.

接著將前述混合液投入於離心分離機(固液分離機)10以進行離心分離,將混合液分離為沉澱物(含有Si4+)與上清液(去除Si4+之混酸廢液;不含沉澱物)。所得之沉澱物為103g,所得之上清液為222g。 Next, the mixed liquid is placed in a centrifugal separator (solid-liquid separator) 10 to perform centrifugal separation, and the mixed liquid is separated into a precipitate (containing Si 4+ ) and a supernatant (the mixed acid waste liquid from which Si 4 + is removed; Containing sediment). The obtained precipitate was 103 g, and the obtained supernatant was 222 g.

從XRD(X射線分光分析)的分析結果中,可確認到沉澱物的主成分為矽氟化鉀(K2SiF6)。 From the analysis results of XRD (X-ray spectroscopic analysis), it was confirmed that the main component of the precipitate was potassium cesium fluoride (K 2 SiF 6 ).

(第1蒸餾步驟) (first distillation step)

將前述固液分離機10內的上清液(去除Si4+之混酸廢液)222g投入於第1蒸餾塔11內,並以蒸餾溫度120℃進行蒸餾。藉由該第1蒸餾操作,從第1蒸餾塔11的頂部餾出184g的第1餾出液(含有氫氟酸及鹽酸之混酸液)。 222 g of the supernatant (the mixed acid waste liquid from which Si 4+ was removed) in the solid-liquid separator 10 was placed in the first distillation column 11 and distilled at a distillation temperature of 120 °C. By the first distillation operation, 184 g of the first distillate (containing a mixed acid solution of hydrofluoric acid and hydrochloric acid) was distilled off from the top of the first distillation column 11.

(第2蒸餾步驟) (Second distillation step)

接著將從前述第1蒸餾塔11餾出之第1餾出液184g投入於第2蒸餾塔12內,並以蒸餾溫度120℃進行蒸 餾。藉由該第2蒸餾操作,從第2蒸餾塔12的頂部餾出第2餾出液(混酸液),藉此回收含有混酸之液體61g。在前述第2蒸餾操作後,於第2蒸餾塔12的內部,可回收作為蒸餾殘液之氫氟酸濃縮混酸液(含有濃縮氫氟酸之回收液)113g。 Then, 184 g of the first distillate distilled from the first distillation column 11 is placed in the second distillation column 12, and steamed at a distillation temperature of 120 °C. Distillation. By the second distillation operation, the second distillate (mixed acid solution) is distilled off from the top of the second distillation column 12, whereby 61 g of the liquid containing the mixed acid is recovered. After the second distillation operation, 113 g of a hydrofluoric acid concentrated mixed acid solution (recovered liquid containing concentrated hydrofluoric acid) as a distillation residue can be recovered in the second distillation column 12.

〈實施例3〉 <Example 3>

對於從半導體製造工廠排出之混酸廢液(含有氫氟酸、鹽酸及Si4+之混酸廢液),使用第1圖所示之構成的回收裝置1,如以下所述地實施Si4+去除步驟、第1蒸餾步驟、第2蒸餾步驟。 For the mixed acid waste liquid (mixed acid waste liquid containing hydrofluoric acid, hydrochloric acid, and Si 4+ ) discharged from a semiconductor manufacturing plant, the recovery apparatus 1 having the configuration shown in Fig. 1 is used, and Si 4+ removal is performed as described below. Step, first distillation step, and second distillation step.

(Si4+去除步驟) (Si 4+ removal step)

將前述混酸廢液(含有成分及各成分的含有率如第3表所示)300g及氟化鈉18g投入於混合槽9後,藉由攪拌葉片攪拌混合24小時而得到混合液。 300 g of the mixed acid waste liquid (containing the components and the content of each component as shown in Table 3) and 18 g of sodium fluoride were placed in the mixing tank 9, and the mixture was stirred and mixed for 24 hours by a stirring blade to obtain a mixed liquid.

接著將前述混合液投入於離心分離機(固液分離機)10以進行離心分離,將混合液分離為沉澱物(含有Si4+)與上清液(去除Si4+之混酸廢液;不含沉澱物)。所得之沉澱物為69g,所得之上清液為248g。 Next, the mixed liquid is placed in a centrifugal separator (solid-liquid separator) 10 to perform centrifugal separation, and the mixed liquid is separated into a precipitate (containing Si 4+ ) and a supernatant (the mixed acid waste liquid from which Si 4 + is removed; Containing sediment). The obtained precipitate was 69 g, and the obtained supernatant was 248 g.

從XRD(X射線分光分析)的分析結果中,可確認到沉澱物的主成分為矽氟化鈉(Na2SiF6)。 From the analysis results of XRD (X-ray spectroscopic analysis), it was confirmed that the main component of the precipitate was sodium bismuth fluoride (Na 2 SiF 6 ).

(第1蒸餾步驟) (first distillation step)

將前述固液分離機10內的上清液(去除Si4+之混酸廢液)248g投入於第1蒸餾塔11內,並以蒸餾溫度120℃進行蒸餾。藉由該第1蒸餾操作,從第1蒸餾塔11的頂部餾出212g的第1餾出液(含有氫氟酸及鹽酸之混酸液)。 248 g of the supernatant (the mixed acid waste liquid from which Si 4+ was removed) in the solid-liquid separator 10 was placed in the first distillation column 11 and distilled at a distillation temperature of 120 °C. By the first distillation operation, 212 g of the first distillate (containing the mixed acid solution of hydrofluoric acid and hydrochloric acid) was distilled off from the top of the first distillation column 11.

(第2蒸餾步驟) (Second distillation step)

接著將從前述第1蒸餾塔11餾出之第1餾出液212g投入於第2蒸餾塔12內,並以蒸餾溫度120℃進行蒸餾。藉由該第2蒸餾操作,從第2蒸餾塔12的頂部餾出第2餾出液(混酸液),藉此回收含有混酸之液體76g。 在前述第2蒸餾操作後,於第2蒸餾塔12的內部,可回收作為蒸餾殘液之氫氟酸濃縮混酸液(含有濃縮氫氟酸之回收液)125g。 Then, 212 g of the first distillate distilled from the first distillation column 11 was placed in the second distillation column 12, and distillation was carried out at a distillation temperature of 120 °C. By the second distillation operation, the second distillate (mixed acid solution) is distilled off from the top of the second distillation column 12, whereby 76 g of the liquid containing the mixed acid is recovered. After the second distillation operation, 125 g of a hydrofluoric acid concentrated mixed acid solution (recovered liquid containing concentrated hydrofluoric acid) as a distillation residue can be recovered in the second distillation column 12.

〈實施例4〉 <Example 4>

對於從半導體製造工廠排出之混酸廢液(含有氫氟酸、鹽酸及Si4+之混酸廢液),使用第1圖所示之構成的回收裝置1,如以下所述地實施Si4+去除步驟、第1蒸餾步驟、第2蒸餾步驟。 For the mixed acid waste liquid (mixed acid waste liquid containing hydrofluoric acid, hydrochloric acid, and Si 4+ ) discharged from a semiconductor manufacturing plant, the recovery apparatus 1 having the configuration shown in Fig. 1 is used, and Si 4+ removal is performed as described below. Step, first distillation step, and second distillation step.

(Si4+去除步驟) (Si 4+ removal step)

將前述混酸廢液(含有成分及各成分的含有率如第4表所示)300g及氯化鉀32g投入於混合槽9後,藉由攪 拌葉片攪拌混合24小時而得到混合液。 300 g of the mixed acid waste liquid (containing the components and the content of each component as shown in Table 4) and 32 g of potassium chloride were placed in the mixing tank 9, and then stirred. The mixture was stirred and mixed for 24 hours to obtain a mixed solution.

接著將前述混合液投入於離心分離機(固液分離機)10以進行離心分離,將混合液分離為沉澱物(含有Si4+)與上清液(去除Si4+之混酸廢液;不含沉澱物)。所得之沉澱物為112g,所得之上清液為220g。 Next, the mixed liquid is placed in a centrifugal separator (solid-liquid separator) 10 to perform centrifugal separation, and the mixed liquid is separated into a precipitate (containing Si 4+ ) and a supernatant (the mixed acid waste liquid from which Si 4 + is removed; Containing sediment). The obtained precipitate was 112 g, and the obtained supernatant was 220 g.

從XRD(X射線分光分析)的分析結果中,可確認到沉澱物的主成分為矽氟化鉀(K2SiF6)。 From the analysis results of XRD (X-ray spectroscopic analysis), it was confirmed that the main component of the precipitate was potassium cesium fluoride (K 2 SiF 6 ).

(第1蒸餾步驟) (first distillation step)

將前述固液分離機10內的上清液(去除Si4+之混酸廢液)220g投入於第1蒸餾塔11內,並以蒸餾溫度110℃進行蒸餾。藉由該第1蒸餾操作,從第1蒸餾塔11的頂部餾出176g的第1餾出液(含有氫氟酸及鹽酸之混酸液)。 220 g of the supernatant (the mixed acid waste liquid from which Si 4+ was removed) in the solid-liquid separator 10 was placed in the first distillation column 11 and distilled at a distillation temperature of 110 °C. By the first distillation operation, 176 g of the first distillate (containing the mixed acid solution of hydrofluoric acid and hydrochloric acid) was distilled off from the top of the first distillation column 11.

(第2蒸餾步驟) (Second distillation step)

接著將從前述第1蒸餾塔11餾出之第1餾出液176g投入於第2蒸餾塔12內,並以蒸餾溫度110℃進行蒸餾。藉由該第2蒸餾操作,從第2蒸餾塔12的頂部餾出第2餾出液(混酸液),藉此回收含有混酸之液體67g。在前述第2蒸餾操作後,於第2蒸餾塔12的內部,可回收作為蒸餾殘液之氫氟酸濃縮混酸液(含有濃縮氫氟酸之回收液)101g。 Next, 176 g of the first distillate distilled from the first distillation column 11 was placed in the second distillation column 12, and distillation was carried out at a distillation temperature of 110 °C. By the second distillation operation, the second distillate (mixed acid solution) is distilled off from the top of the second distillation column 12, whereby 67 g of the liquid containing the mixed acid is recovered. After the second distillation operation, 101 g of a hydrofluoric acid concentrated mixed acid solution (recovered liquid containing concentrated hydrofluoric acid) as a distillation residue was collected in the second distillation column 12.

〈實施例5〉 <Example 5>

對於從半導體製造工廠排出之混酸廢液(含有氫氟酸、鹽酸及Si4+之混酸廢液),使用第1圖所示之構成的回收裝置1,如以下所述地實施Si4+去除步驟、第1蒸餾步驟、第2蒸餾步驟。 For the mixed acid waste liquid (mixed acid waste liquid containing hydrofluoric acid, hydrochloric acid, and Si 4+ ) discharged from a semiconductor manufacturing plant, the recovery apparatus 1 having the configuration shown in Fig. 1 is used, and Si 4+ removal is performed as described below. Step, first distillation step, and second distillation step.

(Si4+去除步驟) (Si 4+ removal step)

將前述混酸廢液(含有成分及各成分的含有率如第5表所示)300g及氟化鎂13g投入於混合槽9後,藉由攪拌葉片攪拌混合24小時而得到混合液。 300 g of the mixed acid waste liquid (containing the components and the content of each component as shown in Table 5) and 13 g of magnesium fluoride were placed in the mixing tank 9, and the mixture was stirred and mixed for 24 hours by a stirring blade to obtain a mixed liquid.

接著將前述混合液投入於離心分離機(固液分離機)10以進行離心分離,將混合液分離為沉澱物(含有Si4+)與上清液(去除Si4+之混酸廢液;不含沉澱物)。所得之沉澱物為58g,所得之上清液為255g。 Next, the mixed liquid is placed in a centrifugal separator (solid-liquid separator) 10 to perform centrifugal separation, and the mixed liquid is separated into a precipitate (containing Si 4+ ) and a supernatant (the mixed acid waste liquid from which Si 4 + is removed; Containing sediment). The obtained precipitate was 58 g, and the obtained supernatant was 255 g.

從XRD(X射線分光分析)的分析結果中,可確認到沉澱物的主成分為矽氟化鎂(MgSiF6)。 From the analysis results of XRD (X-ray spectroscopic analysis), it was confirmed that the main component of the precipitate was magnesium fluorinated magnesium fluoride (MgSiF 6 ).

(第1蒸餾步驟) (first distillation step)

將前述固液分離機10內的上清液(去除Si4+之混酸廢液)255g投入於第1蒸餾塔11內,並以蒸餾溫度120℃進行蒸餾。藉由該第1蒸餾操作,從第1蒸餾塔11的頂部餾出214g的第1餾出液(含有氫氟酸及鹽酸之混酸液)。 255 g of the supernatant (the mixed acid waste liquid from which Si 4+ was removed) in the solid-liquid separator 10 was placed in the first distillation column 11 and distilled at a distillation temperature of 120 °C. By the first distillation operation, 214 g of the first distillate (containing a mixed acid solution of hydrofluoric acid and hydrochloric acid) was distilled off from the top of the first distillation column 11.

(第2蒸餾步驟) (Second distillation step)

接著將從前述第1蒸餾塔11餾出之第1餾出液214g投入於第2蒸餾塔12內,並以蒸餾溫度120℃進行蒸餾。藉由該第2蒸餾操作,從第2蒸餾塔12的頂部餾出第2餾出液(混酸液),藉此回收含有混酸之液體61g。在前述第2蒸餾操作後,於第2蒸餾塔12的內部,可回收作為蒸餾殘液之氫氟酸濃縮混酸液(含有濃縮氫氟酸之回收液)142g。 Then, 214 g of the first distillate distilled from the first distillation column 11 was placed in the second distillation column 12, and distillation was carried out at a distillation temperature of 120 °C. By the second distillation operation, the second distillate (mixed acid solution) is distilled off from the top of the second distillation column 12, whereby 61 g of the liquid containing the mixed acid is recovered. After the second distillation operation, 142 g of a hydrofluoric acid concentrated mixed acid solution (recovered liquid containing concentrated hydrofluoric acid) as a distillation residue was collected in the second distillation column 12.

〈實施例6〉 <Example 6>

對於從半導體製造工廠排出之混酸廢液(含有氫氟酸、鹽酸及Si4+之混酸廢液),使用第1圖所示之構成的回收裝置1,如以下所述地實施Si4+去除步驟、第1蒸餾步驟、第2蒸餾步驟。 For discharged from a semiconductor manufacturing plant of the mixed acid waste liquid (containing hydrofluoric acid, hydrochloric acid, and mixed waste of Si 4+), recovery of the configuration shown in FIG 1 of 1, as described below to remove embodiment Si 4+ Step, first distillation step, and second distillation step.

(Si4+去除步驟) (Si 4+ removal step)

將前述混酸廢液(含有成分及各成分的含有率如第6表所示)300g及氟化鋰11g投入於混合槽9後,藉由攪拌葉片攪拌混合24小時而得到混合液。 300 g of the mixed acid waste liquid (containing the components and the content of each component as shown in Table 6) and 11 g of lithium fluoride were placed in the mixing tank 9, and the mixture was stirred and mixed for 24 hours by a stirring blade to obtain a mixed liquid.

接著將前述混合液投入於離心分離機(固液分離機)10以進行離心分離,將混合液分離為沉澱物(含有Si4+)與上清液(去除Si4+之混酸廢液;不含沉澱物)。所得之沉澱物為56g,所得之上清液為255g。 Next, the mixed liquid is placed in a centrifugal separator (solid-liquid separator) 10 to perform centrifugal separation, and the mixed liquid is separated into a precipitate (containing Si 4+ ) and a supernatant (the mixed acid waste liquid from which Si 4 + is removed; Containing sediment). The obtained precipitate was 56 g, and the obtained supernatant was 255 g.

從XRD(X射線分光分析)的分析結果中,可確認到 沉澱物的主成分為矽氟化鋰(Li2SiF6)。 From the analysis results of XRD (X-ray spectroscopic analysis), it was confirmed that the main component of the precipitate was lithium lanthanum fluoride (Li 2 SiF 6 ).

(第1蒸餾步驟) (first distillation step)

將前述固液分離機10內的上清液(去除Si4+之混酸廢液)255g投入於第1蒸餾塔11內,並以蒸餾溫度130℃進行蒸餾。藉由該第1蒸餾操作,從第1蒸餾塔11的頂部餾出205g的第1餾出液(含有氫氟酸及鹽酸之混酸液)。 255 g of the supernatant (the mixed acid waste liquid from which Si 4+ was removed) in the solid-liquid separator 10 was placed in the first distillation column 11 and distilled at a distillation temperature of 130 °C. By the first distillation operation, 205 g of the first distillate (containing the mixed acid solution of hydrofluoric acid and hydrochloric acid) was distilled off from the top of the first distillation column 11.

(第2蒸餾步驟) (Second distillation step)

接著將從前述第1蒸餾塔11餾出之第1餾出液205g投入於第2蒸餾塔12內,並以蒸餾溫度130℃進行蒸餾。藉由該第2蒸餾操作,從第2蒸餾塔12的頂部餾出第2餾出液(混酸液),藉此回收含有混酸之液體69g。在前述第2蒸餾操作後,於第2蒸餾塔12的內部,可回收作為蒸餾殘液之氫氟酸濃縮混酸液(含有濃縮氫氟酸之回收液)124g。 Then, 205 g of the first distillate distilled from the first distillation column 11 was placed in the second distillation column 12, and distillation was carried out at a distillation temperature of 130 °C. By the second distillation operation, the second distillate (mixed acid solution) was distilled off from the top of the second distillation column 12, whereby 69 g of a liquid containing a mixed acid was recovered. After the second distillation operation, 124 g of a hydrofluoric acid concentrated mixed acid solution (recovered liquid containing concentrated hydrofluoric acid) as a distillation residue can be recovered in the second distillation column 12.

〈實施例7〉 <Example 7>

對於從半導體製造工廠排出之混酸廢液(含有氫氟酸、鹽酸及Si4+之混酸廢液),使用第1圖所示之構成的回收裝置1,如以下所述地實施Si4+去除步驟、第1蒸餾步驟、第2蒸餾步驟。 For the mixed acid waste liquid (mixed acid waste liquid containing hydrofluoric acid, hydrochloric acid, and Si 4+ ) discharged from a semiconductor manufacturing plant, the recovery apparatus 1 having the configuration shown in Fig. 1 is used, and Si 4+ removal is performed as described below. Step, first distillation step, and second distillation step.

(Si4+去除步驟) (Si 4+ removal step)

將前述混酸廢液(含有成分及各成分的含有率如第7表所示)300g、氯化鈉26g及氯化鉀33g投入於混合槽9後,藉由攪拌葉片攪拌混合24小時而得到混合液。 300 g of the mixed acid waste liquid (containing components and the content of each component as shown in Table 7), 26 g of sodium chloride, and 33 g of potassium chloride were placed in the mixing tank 9, and then stirred and mixed for 24 hours by a stirring blade to obtain a mixture. liquid.

接著將前述混合液投入於離心分離機(固液分離機)10以進行離心分離,將混合液分離為沉澱物(含有Si4+)與上清液(去除Si4+之混酸廢液;不含沉澱物)。所得之沉澱物為156g,所得之上清液為203g。 Next, the mixed liquid is placed in a centrifugal separator (solid-liquid separator) 10 to perform centrifugal separation, and the mixed liquid is separated into a precipitate (containing Si 4+ ) and a supernatant (the mixed acid waste liquid from which Si 4 + is removed; Containing sediment). The obtained precipitate was 156 g, and the obtained supernatant was 203 g.

從XRD(X射線分光分析)的分析結果中,可確認到沉澱物的主成分為矽氟化鈉(Na2SiF6)及矽氟化鉀(K2SiF6)。 From the analysis results of XRD (X-ray spectroscopic analysis), it was confirmed that the main components of the precipitate were sodium bismuth fluoride (Na 2 SiF 6 ) and potassium cesium fluoride (K 2 SiF 6 ).

(第1蒸餾步驟) (first distillation step)

將前述固液分離機10內的上清液(去除Si4+之混酸廢液)203g投入於第1蒸餾塔11內,並以蒸餾溫度120℃進行蒸餾。藉由該第1蒸餾操作,從第1蒸餾塔11的頂部餾出172g的第1餾出液(含有氫氟酸及鹽酸之混酸液)。 203 g of the supernatant (the mixed acid waste liquid from which Si 4+ was removed) in the solid-liquid separator 10 was placed in the first distillation column 11 and distilled at a distillation temperature of 120 °C. By the first distillation operation, 172 g of the first distillate (containing the mixed acid solution of hydrofluoric acid and hydrochloric acid) was distilled off from the top of the first distillation column 11.

(第2蒸餾步驟) (Second distillation step)

接著將從前述第1蒸餾塔11餾出之第1餾出液172g投入於第2蒸餾塔12內,並以蒸餾溫度120℃進行蒸餾。藉由該第2蒸餾操作,從第2蒸餾塔12的頂部餾出第2餾出液(混酸液),藉此回收含有混酸之液體95g。 在前述第2蒸餾操作後,於第2蒸餾塔12的內部,可回收作為蒸餾殘液之氫氟酸濃縮混酸液(含有濃縮氫氟酸之回收液)64g。 Then, 172 g of the first distillate distilled from the first distillation column 11 was placed in the second distillation column 12, and distillation was carried out at a distillation temperature of 120 °C. By the second distillation operation, the second distillate (mixed acid solution) is distilled off from the top of the second distillation column 12, whereby 95 g of the liquid containing the mixed acid is recovered. After the second distillation operation, 64 g of a hydrofluoric acid concentrated mixed acid solution (recovered liquid containing concentrated hydrofluoric acid) as a distillation residue can be recovered in the second distillation column 12.

〈實施例8〉 <Example 8>

對於從半導體製造工廠排出之混酸廢液(含有氫氟酸、鹽酸及Si4+之混酸廢液),使用第1圖所示之構成的回收裝置1,如以下所述地實施Si4+去除步驟、第1蒸餾步驟、第2蒸餾步驟。 For the mixed acid waste liquid (mixed acid waste liquid containing hydrofluoric acid, hydrochloric acid, and Si 4+ ) discharged from a semiconductor manufacturing plant, the recovery apparatus 1 having the configuration shown in Fig. 1 is used, and Si 4+ removal is performed as described below. Step, first distillation step, and second distillation step.

(Si4+去除步驟) (Si 4+ removal step)

將前述混酸廢液(含有成分及各成分的含有率如第8表所示)300g、氯化鉀33g及氟化鈉19g投入於混合槽9後,藉由攪拌葉片攪拌混合24小時而得到混合液。 300 g of the mixed acid waste liquid (containing the components and the content of each component as shown in Table 8), 33 g of potassium chloride, and 19 g of sodium fluoride were placed in the mixing tank 9, and then stirred and mixed for 24 hours by a stirring blade to obtain a mixture. liquid.

接著將前述混合液投入於離心分離機(固液分離機)10以進行離心分離,將混合液分離為沉澱物(含有Si4+)與上清液(去除Si4+之混酸廢液;不含沉澱物)。所得之沉澱物為162g,所得之上清液為190g。 Next, the mixed liquid is placed in a centrifugal separator (solid-liquid separator) 10 to perform centrifugal separation, and the mixed liquid is separated into a precipitate (containing Si 4+ ) and a supernatant (the mixed acid waste liquid from which Si 4 + is removed; Containing sediment). The obtained precipitate was 162 g, and the obtained supernatant was 190 g.

從XRD(X射線分光分析)的分析結果中,可確認到沉澱物的主成分為矽氟化鈉(Na2SiF6)及矽氟化鉀(K2SiF6)。 From the analysis results of XRD (X-ray spectroscopic analysis), it was confirmed that the main components of the precipitate were sodium bismuth fluoride (Na 2 SiF 6 ) and potassium cesium fluoride (K 2 SiF 6 ).

(第1蒸餾步驟) (first distillation step)

將前述固液分離機10內的上清液(去除Si4+之混酸廢液)190g投入於第1蒸餾塔11內,並以蒸餾溫度120 ℃進行蒸餾。藉由該第1蒸餾操作,從第1蒸餾塔11的頂部餾出166g的第1餾出液(含有氫氟酸及鹽酸之混酸液)。 190 g of the supernatant (the mixed acid waste liquid from which Si 4+ was removed) in the solid-liquid separator 10 was placed in the first distillation column 11 and distilled at a distillation temperature of 120 °C. By the first distillation operation, 166 g of the first distillate (containing the mixed acid solution of hydrofluoric acid and hydrochloric acid) was distilled off from the top of the first distillation column 11.

(第2蒸餾步驟) (Second distillation step)

接著將從前述第1蒸餾塔11餾出之第1餾出液166g投入於第2蒸餾塔12內,並以蒸餾溫度120℃進行蒸餾。藉由該第2蒸餾操作,從第2蒸餾塔12的頂部餾出第2餾出液(混酸液),藉此回收含有混酸之液體76g。在前述第2蒸餾操作後,於第2蒸餾塔12的內部,可回收作為蒸餾殘液之氫氟酸濃縮混酸液(含有濃縮氫氟酸之回收液)83g。 Then, 166 g of the first distillate distilled from the first distillation column 11 was placed in the second distillation column 12, and distillation was carried out at a distillation temperature of 120 °C. By the second distillation operation, the second distillate (mixed acid solution) is distilled off from the top of the second distillation column 12, whereby 76 g of the liquid containing the mixed acid is recovered. After the second distillation operation, 83 g of a hydrofluoric acid concentrated mixed acid solution (recovered liquid containing concentrated hydrofluoric acid) as a distillation residue was collected in the second distillation column 12.

〈實施例9〉 <Example 9>

對於從半導體製造工廠排出之混酸廢液(含有氫氟酸、鹽酸及Si4+之混酸廢液),使用第1圖所示之構成的回收裝置1,如以下所述地實施Si4+去除步驟、第1蒸餾步驟、第2蒸餾步驟。 For the mixed acid waste liquid (mixed acid waste liquid containing hydrofluoric acid, hydrochloric acid, and Si 4+ ) discharged from a semiconductor manufacturing plant, the recovery apparatus 1 having the configuration shown in Fig. 1 is used, and Si 4+ removal is performed as described below. Step, first distillation step, and second distillation step.

(Si4+去除步驟) (Si 4+ removal step)

將前述混酸廢液(含有成分及各成分的含有率如第9表所示)300g、氯化鈉26g及氟化鉀26g投入於混合槽9後,藉由攪拌葉片攪拌混合24小時而得到混合液。 300 g of the mixed acid waste liquid (containing components and the content of each component as shown in Table 9), 26 g of sodium chloride, and 26 g of potassium fluoride were placed in the mixing tank 9, and then stirred and stirred for 24 hours by a stirring blade to obtain a mixture. liquid.

接著將前述混合液投入於離心分離機(固液分離機)10以進行離心分離,將混合液分離為沉澱物(含有Si4+) 與上清液(去除Si4+之混酸廢液;不含沉澱物)。所得之沉澱物為160g,所得之上清液為192g。 Next, the mixed liquid is placed in a centrifugal separator (solid-liquid separator) 10 to carry out centrifugation, and the mixed liquid is separated into a precipitate (containing Si 4+ ) and a supernatant liquid (the mixed acid waste liquid from which Si 4+ is removed; Containing sediment). The obtained precipitate was 160 g, and the obtained supernatant was 192 g.

從XRD(X射線分光分析)的分析結果中,可確認到沉澱物的主成分為矽氟化鈉(Na2SiF6)及矽氟化鉀(K2SiF6)。 From the analysis results of XRD (X-ray spectroscopic analysis), it was confirmed that the main components of the precipitate were sodium bismuth fluoride (Na 2 SiF 6 ) and potassium cesium fluoride (K 2 SiF 6 ).

(第1蒸餾步驟) (first distillation step)

將前述固液分離機10內的上清液(去除Si4+之混酸廢液)192g投入於第1蒸餾塔11內,並以蒸餾溫度120℃進行蒸餾。藉由該第1蒸餾操作,從第1蒸餾塔11的頂部餾出169g的第1餾出液(含有氫氟酸及鹽酸之混酸液)。 192 g of the supernatant (the mixed acid waste liquid from which Si 4+ was removed) in the solid-liquid separator 10 was placed in the first distillation column 11 and distilled at a distillation temperature of 120 °C. By the first distillation operation, 169 g of the first distillate (containing the mixed acid solution of hydrofluoric acid and hydrochloric acid) was distilled off from the top of the first distillation column 11.

(第2蒸餾步驟) (Second distillation step)

接著將從前述第1蒸餾塔11餾出之第1餾出液169g投入於第2蒸餾塔12內,並以蒸餾溫度120℃進行蒸餾。藉由該第2蒸餾操作,從第2蒸餾塔12的頂部餾出第2餾出液(混酸液),藉此回收含有混酸之液體78g。在前述第2蒸餾操作後,於第2蒸餾塔12的內部,可回收作為蒸餾殘液之氫氟酸濃縮混酸液(含有濃縮氫氟酸之回收液)81g。 Then, 169 g of the first distillate distilled from the first distillation column 11 was placed in the second distillation column 12, and distillation was carried out at a distillation temperature of 120 °C. By the second distillation operation, the second distillate (mixed acid solution) is distilled off from the top of the second distillation column 12, thereby recovering 78 g of the liquid containing the mixed acid. After the second distillation operation, 81 g of a hydrofluoric acid concentrated mixed acid solution (recovered liquid containing concentrated hydrofluoric acid) as a distillation residue was collected in the second distillation column 12.

〈實施例10〉 <Example 10>

對於從半導體製造工廠排出之混酸廢液(含有氫氟 酸、鹽酸及Si4+之混酸廢液),使用第1圖所示之構成的回收裝置1,如以下所述地實施Si4+去除步驟、第1蒸餾步驟、第2蒸餾步驟。 For the mixed acid waste liquid (mixed acid waste liquid containing hydrofluoric acid, hydrochloric acid, and Si 4+ ) discharged from a semiconductor manufacturing plant, the recovery apparatus 1 having the configuration shown in Fig. 1 is used, and Si 4+ removal is performed as described below. Step, first distillation step, and second distillation step.

(Si4+去除步驟) (Si 4+ removal step)

將前述混酸廢液(含有成分及各成分的含有率如第10表所示)300g、氟化鈉19g及氟化鉀26g投入於混合槽9後,藉由攪拌葉片攪拌混合24小時而得到混合液。 300 g of the mixed acid waste liquid (containing the components and the content of each component as shown in Table 10), 19 g of sodium fluoride, and 26 g of potassium fluoride were placed in the mixing tank 9, and then stirred and mixed for 24 hours by a stirring blade to obtain a mixture. liquid.

接著將前述混合液投入於離心分離機(固液分離機)10以進行離心分離,將混合液分離為沉澱物(含有Si4+)與上清液(去除Si4+之混酸廢液;不含沉澱物)。所得之沉澱物為158g,所得之上清液為187g。 Next, the mixed liquid is placed in a centrifugal separator (solid-liquid separator) 10 to perform centrifugal separation, and the mixed liquid is separated into a precipitate (containing Si 4+ ) and a supernatant (the mixed acid waste liquid from which Si 4 + is removed; Containing sediment). The obtained precipitate was 158 g, and the obtained supernatant was 187 g.

從XRD(X射線分光分析)的分析結果中,可確認到沉澱物的主成分為矽氟化鈉(Na2SiF6)及矽氟化鉀(K2SiF6)。 From the analysis results of XRD (X-ray spectroscopic analysis), it was confirmed that the main components of the precipitate were sodium bismuth fluoride (Na 2 SiF 6 ) and potassium cesium fluoride (K 2 SiF 6 ).

(第1蒸餾步驟) (first distillation step)

將前述固液分離機10內的上清液(去除Si4+之混酸廢液)187g投入於第1蒸餾塔11內,並以蒸餾溫度120℃進行蒸餾。藉由該第1蒸餾操作,從第1蒸餾塔11的頂部餾出162g的第1餾出液(含有氫氟酸及鹽酸之混酸液)。 187 g of the supernatant (the mixed acid waste liquid from which Si 4+ was removed) in the solid-liquid separator 10 was placed in the first distillation column 11 and distilled at a distillation temperature of 120 °C. By the first distillation operation, 162 g of the first distillate (containing the mixed acid solution of hydrofluoric acid and hydrochloric acid) was distilled off from the top of the first distillation column 11.

(第2蒸餾步驟) (Second distillation step)

接著將從前述第1蒸餾塔11餾出之第1餾出液162g 投入於第2蒸餾塔12內,並以蒸餾溫度120℃進行蒸餾。藉由該第2蒸餾操作,從第2蒸餾塔12的頂部餾出第2餾出液(混酸液),藉此回收含有混酸之液體59g。在前述第2蒸餾操作後,於第2蒸餾塔12的內部,可回收作為蒸餾殘液之氫氟酸濃縮混酸液(含有濃縮氫氟酸之回收液)95g。 Next, the first distillate discharged from the first distillation column 11 is 162 g. It was placed in the second distillation column 12 and distilled at a distillation temperature of 120 °C. By the second distillation operation, the second distillate (mixed acid solution) was distilled off from the top of the second distillation column 12, whereby 59 g of a liquid containing a mixed acid was recovered. After the second distillation operation, 95 g of a hydrofluoric acid concentrated mixed acid solution (recovered liquid containing concentrated hydrofluoric acid) as a distillation residue can be recovered in the second distillation column 12.

〈實施例11〉 <Example 11>

對於從半導體製造工廠排出之混酸廢液(含有氫氟酸、鹽酸及Si4+之混酸廢液),使用第1圖所示之構成的回收裝置1,如以下所述地實施Si4+去除步驟、第1蒸餾步驟、第2蒸餾步驟。 For the mixed acid waste liquid (mixed acid waste liquid containing hydrofluoric acid, hydrochloric acid, and Si 4+ ) discharged from a semiconductor manufacturing plant, the recovery apparatus 1 having the configuration shown in Fig. 1 is used, and Si 4+ removal is performed as described below. Step, first distillation step, and second distillation step.

(Si4+去除步驟) (Si 4+ removal step)

將前述混酸廢液(含有成分及各成分的含有率如第11表所示)300g、氯化鈉18g、氟化鈉13g及氟化鉀18g投入於混合槽9後,藉由攪拌葉片攪拌混合24小時而得到混合液。 300 g of the mixed acid waste liquid (containing components and the content of each component as shown in Table 11), 18 g of sodium chloride, 13 g of sodium fluoride, and 18 g of potassium fluoride were placed in the mixing tank 9, and then stirred and mixed by a stirring blade. A mixture was obtained for 24 hours.

接著將前述混合液投入於離心分離機(固液分離機)10以進行離心分離,將混合液分離為沉澱物(含有Si4+)與上清液(去除Si4+之混酸廢液;不含沉澱物)。所得之沉澱物為154g,所得之上清液為195g。 Next, the mixed liquid is placed in a centrifugal separator (solid-liquid separator) 10 to perform centrifugal separation, and the mixed liquid is separated into a precipitate (containing Si 4+ ) and a supernatant (the mixed acid waste liquid from which Si 4 + is removed; Containing sediment). The obtained precipitate was 154 g, and the obtained supernatant was 195 g.

從XRD(X射線分光分析)的分析結果中,可確認到沉澱物的主成分為矽氟化鈉(Na2SiF6)及矽氟化鉀 (K2SiF6)。 From the analysis results of XRD (X-ray spectroscopic analysis), it was confirmed that the main components of the precipitate were sodium argon fluoride (Na 2 SiF 6 ) and potassium cesium fluoride (K 2 SiF 6 ).

(第1蒸餾步驟) (first distillation step)

將前述固液分離機10內的上清液(去除Si4+之混酸廢液)195g投入於第1蒸餾塔11內,並以蒸餾溫度120℃進行蒸餾。藉由該第1蒸餾操作,從第1蒸餾塔11的頂部餾出171g的第1餾出液(含有氫氟酸及鹽酸之混酸液)。 195 g of the supernatant (the mixed acid waste liquid from which Si 4+ was removed) in the solid-liquid separator 10 was placed in the first distillation column 11 and distilled at a distillation temperature of 120 °C. By the first distillation operation, 171 g of the first distillate (containing the mixed acid solution of hydrofluoric acid and hydrochloric acid) was distilled off from the top of the first distillation column 11.

(第2蒸餾步驟) (Second distillation step)

接著將從前述第1蒸餾塔11餾出之第1餾出液171g投入於第2蒸餾塔12內,並以蒸餾溫度120℃進行蒸餾。藉由該第2蒸餾操作,從第2蒸餾塔12的頂部餾出第2餾出液(混酸液),藉此回收含有混酸之液體66g。在前述第2蒸餾操作後,於第2蒸餾塔12的內部,可回收作為蒸餾殘液之氫氟酸濃縮混酸液(含有濃縮氫氟酸之回收液)99g。 Then, 171 g of the first distillate distilled from the first distillation column 11 was placed in the second distillation column 12, and distillation was carried out at a distillation temperature of 120 °C. By the second distillation operation, the second distillate (mixed acid solution) is distilled off from the top of the second distillation column 12, thereby recovering 66 g of the liquid containing the mixed acid. After the second distillation operation, 99 g of a hydrofluoric acid concentrated mixed acid solution (recovered liquid containing concentrated hydrofluoric acid) as a distillation residue can be recovered in the second distillation column 12.

〈比較例1〉 <Comparative Example 1>

除了未將氯化鈉投入於混合槽(未實施Si4+去除步驟)之外,其他與實施例1相同地實施第1蒸餾步驟,亦即將從半導體製造工廠排出之混酸廢液(含有成分及各成分的含有率如第12表所示)直接投入於第1蒸餾塔11內,並以蒸餾溫度120℃進行蒸餾,在從第1蒸餾塔11的頂部所得到之第1餾出液中,與處理對象之混酸廢液的 Si含有率(2.02質量%)同等之含有率(2.23質量%)的Si殘存,無法完全去除Si4+The first distillation step was carried out in the same manner as in Example 1 except that sodium chloride was not introduced into the mixing tank (the Si 4+ removal step was not carried out), that is, the mixed acid waste liquid (containing the components and discharged from the semiconductor manufacturing plant) The content of each component is directly introduced into the first distillation column 11 and is distilled at a distillation temperature of 120 ° C. The first distillate obtained from the top of the first distillation column 11 is subjected to distillation. Si remaining in the content ratio (2.23 mass%) equivalent to the Si content (2.02 mass%) of the mixed acid waste liquid to be treated was not completely removed, and Si 4+ could not be completely removed.

上述實施例及比較例中,各液中的HF、HCl、H2SO4之各成分的濃度(含有質量%),係使用離子質譜儀(Dionex Japan公司製「ICS-1000」)來測定。 In the above examples and comparative examples, the concentration (% by mass) of each component of HF, HCl, and H 2 SO 4 in each liquid was measured using an ion mass spectrometer ("ICS-1000" manufactured by Dionex Japan Co., Ltd.).

此外,Si的定性及定量分析,係使用ICP發光分析裝置(島津製作所公司製「ICPS-7510」)來進行。 In addition, the qualitative and quantitative analysis of Si was carried out using an ICP emission spectrometer ("ICPS-7510" manufactured by Shimadzu Corporation).

從此等表中,可明確地得知在適用本發明之回收方法之實施例1~11中,從含有氫氟酸、鹽酸及Si4+之混酸廢液,分別回收雜質(含有Si4+之金屬離子)少之混酸液,以及雜質(含有Si4+之金屬離子)少之氫氟酸濃縮混酸液。 From this table and the like, may be explicitly known recovery method in the embodiment of the present invention is applied 1 to 11, containing from hydrofluoric acid, hydrochloric acid, and mixed waste of Si 4+, impurities were recovered (containing the Si 4+ A mixed acid solution containing a small amount of metal ions and a small amount of hydrofluoric acid concentrated mixed acid having a small amount of impurities (metal ions containing Si 4+ ).

相對於此,未將鹽添加於混酸廢液而進行蒸餾操作之比較例1中,經由蒸餾所餾出之混酸液中,含有多量的Si4+,無法去除混入之Si4+On the other hand, in Comparative Example 1 in which the salt was not added to the mixed acid waste liquid and the distillation operation was performed, the mixed acid solution distilled by distillation contained a large amount of Si 4+ , and the mixed Si 4+ could not be removed.

產業上之可應用性: Industrial applicability:

本發明之從含有Si之氫氟酸系廢液去除Si之方法,例如可利用作為:從使用作為蝕刻劑等之氫氟酸系廢液(例如含有氫氟酸之廢液、含有氫氟酸及鹽酸之混酸廢液等)回收氫氟酸時之前處理方法,但並不特別限定於適用該用途者。 In the method for removing Si from a hydrofluoric acid-based waste liquid containing Si, for example, a hydrofluoric acid-based waste liquid (for example, a waste liquid containing hydrofluoric acid or a hydrofluoric acid) which is used as an etchant can be used. The method of treating the hydrofluoric acid in the case of recovering hydrofluoric acid, and the like, and the hydrochloric acid waste liquid, etc., is not particularly limited to those suitable for the use.

本發明之從含有Si之氫氟酸系混酸廢液回收氫氟酸之方法,例如可利用在從使用作為蝕刻劑等之氫氟酸系混酸廢液(含有氫氟酸及鹽酸之混酸廢液等)分別回收混酸 液、氫氟酸濃縮混酸液者。 In the method for recovering hydrofluoric acid from a hydrofluoric acid-based mixed acid waste liquid containing Si, for example, a hydrofluoric acid-based mixed acid waste liquid (using a mixed acid solution containing hydrofluoric acid and hydrochloric acid) which is used as an etchant or the like can be used. Etc.) separately recovering mixed acid Liquid, hydrofluoric acid concentrated mixed acid solution.

本申請案係伴隨著2012年11月15日提出申請之日本國特許出願特願2012-251319號以及2013年9月19日提出申請之日本國特許出願特願2013-193960號之優先權主張,其揭示內容直接構成本申請案的一部分。 This application is a priority claim of Japanese Patent Application No. 2012-251319, which is filed on November 15, 2012, and Japanese Patent Application No. 2013-193960, filed on September 19, 2013. The disclosure thereof forms a part of this application.

在此所使用之用語及說明,係用以說明本發明之實施形態,但本發明並不限定於此。本發明,只要在申請專利範圍內不脫離該精神者,均容許任何的設計變更。 The terms and descriptions used herein are for describing embodiments of the invention, but the invention is not limited thereto. The present invention allows any design change as long as it does not deviate from the spirit within the scope of the patent application.

1‧‧‧回收裝置 1‧‧‧Recycling device

9‧‧‧混合槽 9‧‧‧ mixing tank

10‧‧‧固液分離機 10‧‧‧ solid liquid separator

11‧‧‧第1蒸餾塔 11‧‧‧1st distillation tower

12‧‧‧第2蒸餾塔 12‧‧‧2nd distillation tower

Claims (21)

一種從含有Si之氫氟酸系廢液去除Si之方法,其特徵為包含:將鹽添加於含有氫氟酸及Si之廢液後,去除因該鹽的添加所產生之沉澱物而得到去除Si之廢液之Si去除步驟。 A method for removing Si from a hydrofluoric acid-based waste liquid containing Si, comprising: removing a precipitate containing the hydrofluoric acid and Si, removing the precipitate generated by the addition of the salt, and removing the salt Si removal step of the waste liquid of Si. 一種從含有Si之氫氟酸系廢液去除Si之方法,其特徵為包含:將鹽添加於含有氫氟酸及Si之廢液後,去除因該鹽的添加所產生之沉澱物而得到去除Si之廢液之Si去除步驟;以及藉由蒸餾前述去除Si之廢液,使含有氫氟酸之液體餾出而得到餾出液之蒸餾步驟。 A method for removing Si from a hydrofluoric acid-based waste liquid containing Si, comprising: removing a precipitate containing the hydrofluoric acid and Si, removing the precipitate generated by the addition of the salt, and removing the salt a Si removing step of the waste liquid of Si; and a distillation step of distilling the liquid containing hydrofluoric acid to obtain a distillate by distilling the waste liquid from which Si is removed. 如申請專利範圍第1或2項之從含有Si之氫氟酸系廢液去除Si之方法,其中前述鹽係使用選自由氟化金屬鹽及氯化金屬鹽所組成之群組之1種或2種以上的鹽。 A method for removing Si from a hydrofluoric acid-based waste liquid containing Si according to claim 1 or 2, wherein the salt is one selected from the group consisting of a metal fluoride salt and a metal chloride salt or Two or more kinds of salts. 如申請專利範圍第1或2項之從含有Si之氫氟酸系廢液去除Si之方法,其中前述鹽係使用選自由氟化鉀、氟化鈉、氯化鉀、氯化鈉、氟化鎂及氟化鋰所組成之群組之1種或2種以上的鹽。 A method for removing Si from a hydrofluoric acid-containing waste liquid containing Si according to claim 1 or 2, wherein the salt is selected from the group consisting of potassium fluoride, sodium fluoride, potassium chloride, sodium chloride, and fluorination. One or two or more salts of the group consisting of magnesium and lithium fluoride. 如申請專利範圍第1至4項中任一項之從含有Si之氫氟酸系廢液去除Si之方法,其中前述將鹽添加於廢液之添加步驟,係經由供給管將前述廢液供給至混合槽,並同時將前述鹽供給至前述混合槽來進行,於該添加步驟 之前,具備:藉由設置在前述供給管之質量流量計,測量通過該供給管之廢液的流量及密度之測量步驟;於計算機中,根據前述質量流量計所測量之前述流量及密度的資料,計算通過前述供給管之廢液中的Si質量,並根據該計算值來計算Si的沉澱化所需之鹽的質量之計算步驟;以及藉由計量器來計量前述計算機所計算之質量的鹽,並送入前述混合槽之計量步驟。 The method for removing Si from a hydrofluoric acid-based waste liquid containing Si according to any one of claims 1 to 4, wherein the step of adding the salt to the waste liquid is to supply the waste liquid through a supply pipe. To the mixing tank, and simultaneously feeding the salt to the mixing tank, in the adding step Previously, there is provided a measuring step of measuring the flow rate and density of the waste liquid passing through the supply pipe by a mass flow meter disposed in the supply pipe; and the data of the flow rate and density measured by the mass flow meter in the computer Calculating a mass of Si in the waste liquid passing through the supply pipe, and calculating a mass of the salt required for precipitation of Si based on the calculated value; and measuring a salt of the mass calculated by the computer by a meter And feeding the metering step of the aforementioned mixing tank. 一種從含有Si之氫氟酸系混酸廢液回收氫氟酸之方法,其特徵為包含:將鹽添加於含有氫氟酸、鹽酸及Si之混酸廢液後,去除因該鹽的添加所產生之沉澱物而得到去除Si之混酸廢液之Si去除步驟;藉由蒸餾前述去除Si之混酸廢液,使混酸液餾出而得到第1餾出液之第1蒸餾步驟;以及藉由蒸餾在前述第1蒸餾步驟所得之第1餾出液,使混酸液餾出而得到第2餾出液,並且同時回收作為蒸餾殘液的氫氟酸濃縮混酸液之第2蒸餾步驟。 A method for recovering hydrofluoric acid from a hydrofluoric acid-based mixed acid waste liquid containing Si, which comprises: adding a salt to a mixed acid waste liquid containing hydrofluoric acid, hydrochloric acid and Si, and removing the addition of the salt a sediment removal step to obtain a Si removal step for removing the mixed acid waste liquid of Si; a first distillation step of obtaining the first distillate by distilling the above-mentioned mixed acid waste liquid of Si to distill off the mixed acid solution; and by distillation In the first distillate obtained in the first distillation step, the second distillate is distilled off to obtain a second distillate, and the second distillation step of the hydrofluoric acid concentrated mixed acid solution as the distillation residue is simultaneously recovered. 如申請專利範圍第6項之從含有Si之氫氟酸系混酸廢液回收氫氟酸之方法,其中將前述第1蒸餾步驟中的蒸餾溫度設定在80℃~130℃的範圍。 A method for recovering hydrofluoric acid from a hydrofluoric acid-based mixed acid waste liquid containing Si according to the sixth aspect of the patent application, wherein the distillation temperature in the first distillation step is set in the range of 80 ° C to 130 ° C. 如申請專利範圍第6或7項之從含有Si之氫氟酸系混酸廢液回收氫氟酸之方法,其中將前述第2蒸餾步驟 中的蒸餾溫度設定在80℃~130℃的範圍。 A method for recovering hydrofluoric acid from a hydrofluoric acid-based mixed acid waste liquid containing Si according to the sixth or seventh aspect of the patent application, wherein the second distillation step is The distillation temperature in the range is set in the range of 80 ° C to 130 ° C. 如申請專利範圍第6至8項中任一項之從含有Si之氫氟酸系混酸廢液回收氫氟酸之方法,其中前述鹽係使用選自由氟化金屬鹽及氯化金屬鹽所組成之群組之1種或2種以上的鹽。 The method for recovering hydrofluoric acid from a hydrofluoric acid-based mixed acid waste liquid containing Si according to any one of claims 6 to 8, wherein the salt is selected from the group consisting of a metal fluoride salt and a metal chloride salt. One or two or more salts of the group. 如申請專利範圍第6至8項中任一項之從含有Si之氫氟酸系混酸廢液回收氫氟酸之方法,其中前述鹽係使用選自由氟化鉀、氟化鈉、氯化鉀、氯化鈉、氟化鎂及氟化鋰所組成之群組之1種或2種以上的鹽。 A method for recovering hydrofluoric acid from a hydrofluoric acid-based mixed acid waste liquid containing Si according to any one of claims 6 to 8, wherein the salt is selected from the group consisting of potassium fluoride, sodium fluoride, and potassium chloride. One or two or more salts of the group consisting of sodium chloride, magnesium fluoride, and lithium fluoride. 如申請專利範圍第6至10項中任一項之從含有Si之氫氟酸系混酸廢液回收氫氟酸之方法,其中前述將鹽添加於廢液之添加步驟,係經由供給管將前述廢液供給至混合槽,並將前述鹽供給至前述混合槽來進行,於該添加步驟之前,具備:藉由設置在前述供給管之質量流量計,測量通過該供給管之廢液的流量及密度之測量步驟;於計算機中,根據前述質量流量計所測量之前述流量及密度的資料,計算通過前述供給管之廢液中的Si質量,並根據該計算值來計算Si的沉澱化所需之鹽的質量之計算步驟;以及藉由計量器來計量前述計算機所計算之質量的鹽,並送入前述混合槽之計量步驟。 The method for recovering hydrofluoric acid from a hydrofluoric acid-based mixed acid waste liquid containing Si according to any one of claims 6 to 10, wherein the step of adding the salt to the waste liquid is carried out via a supply pipe The waste liquid is supplied to the mixing tank, and the salt is supplied to the mixing tank. Before the adding step, the flow rate of the waste liquid passing through the supply pipe is measured by a mass flow meter provided in the supply pipe. a measuring step of density; calculating, in the computer, the mass of Si in the waste liquid passing through the supply pipe according to the aforementioned flow rate and density measured by the mass flow meter, and calculating the precipitation of Si according to the calculated value a step of calculating the mass of the salt; and a metering step of measuring the mass of the mass calculated by the computer by the meter and feeding it to the mixing tank. 一種從含有Si之氫氟酸系廢液回收氫氟酸之回收裝置,其特徵為 具備:藉由攪拌來混合含有氫氟酸及Si之廢液、及鹽,而得到混合液之混合槽,用於對存在於前述混合液中之沉澱物進行固液分離之固液分離機,以及用於對由前述固液分離機所分離出之濾液進行蒸餾之蒸餾塔。 A recovery device for recovering hydrofluoric acid from a hydrofluoric acid-containing waste liquid containing Si, characterized in that A mixing tank for mixing a waste liquid containing hydrofluoric acid and Si and a salt to obtain a mixed liquid, and a solid-liquid separator for solid-liquid separation of the precipitate present in the mixed liquid, And a distillation column for distilling the filtrate separated by the aforementioned solid-liquid separator. 一種從含有Si之氫氟酸系混酸廢液回收氫氟酸之回收裝置,其特徵為具備:藉由攪拌來混合含有氫氟酸及Si之混酸廢液、及鹽,而得到混合液之混合槽,用於對存在於前述混合液中之沉澱物進行固液分離之固液分離機,用於對由前述固液分離機所分離出之濾液進行蒸餾之第1蒸餾塔,以及用於對從前述第1蒸餾塔餾出之餾出液進行蒸餾之第2蒸餾塔。 A recovery device for recovering hydrofluoric acid from a hydrofluoric acid-based mixed acid waste liquid containing Si, comprising: mixing a mixed acid waste liquid containing hydrofluoric acid and Si and a salt by stirring to obtain a mixed liquid mixture; a solid-liquid separator for solid-liquid separation of a precipitate present in the mixed liquid, a first distillation column for distilling the filtrate separated by the solid-liquid separator, and a pair The second distillation column in which the distillate distilled from the first distillation column is subjected to distillation. 如申請專利範圍第12或13項之回收裝置,其中進一步具備:設置在將前述廢液供給至前述混合槽之供給管,並測量通過該供給管之廢液的流量及密度之質量流量計,根據前述質量流量計所測量之前述流量及密度的資料,計算通過前述供給管之廢液中的Si質量,並根據該計算值來計算Si的沉澱化所需之鹽的質量之計算機,以及 計量前述計算機所計算之質量的鹽,並送入前述混合槽之計量器。 The recovery device of claim 12 or 13, further comprising: a mass flow meter disposed on the supply pipe for supplying the waste liquid to the mixing tank, and measuring a flow rate and a density of the waste liquid passing through the supply pipe, Calculating the mass of the Si in the waste liquid passing through the supply pipe according to the aforementioned flow rate and density measured by the mass flow meter, and calculating the mass of the salt required for the precipitation of Si based on the calculated value, and The salt of the mass calculated by the aforementioned computer is metered and sent to the meter of the aforementioned mixing tank. 一種固液分離裝置,其特徵為具備:可分離固體成分與液體,且可從底部排出分離後之固體成分之固液分離機,容納從前述固液分離機的底部排出之固體成分之污泥罐,與設置在前述污泥罐的底部之排出口連通之排出管,設置在前述排出管之排出閥,以及檢測被容納於前述污泥罐的內部之固體成分的上面位置之界面位置檢測器。 A solid-liquid separation device characterized by comprising: a solid-liquid separator capable of separating a solid component and a liquid, and discharging the separated solid component from the bottom, and accommodating the solid component sludge discharged from the bottom of the solid-liquid separator a tank, a discharge pipe connected to a discharge port provided at a bottom of the sludge tank, a discharge valve provided in the discharge pipe, and an interface position detector for detecting an upper position of a solid component accommodated inside the sludge tank . 如申請專利範圍第15項之固液分離裝置,其中使用超音波界面檢測計作為前述界面位置檢測器。 A solid-liquid separation device according to claim 15 wherein an ultrasonic interface detector is used as the aforementioned interface position detector. 如申請專利範圍第15或16項之固液分離裝置,其中使用液體渦旋機作為前述固液分離機。 A solid-liquid separation device according to claim 15 or 16, wherein a liquid scroll is used as the aforementioned solid-liquid separator. 如申請專利範圍第15至17項中任一項之固液分離裝置,其係具備:將前述固液分離機所分離之液體再供給至該固液分離機內之循環管。 The solid-liquid separation device according to any one of claims 15 to 17, further comprising: a circulation pipe for supplying the liquid separated by the solid-liquid separator to the solid-liquid separator. 如申請專利範圍第15至18項中任一項之固液分離裝置,其係具備:根據前述界面位置檢測器所檢測之固體成分之上面位置的資料,進行前述排出閥的開閉操作或開度調整之控制部。 The solid-liquid separation device according to any one of claims 15 to 18, wherein the opening/closing operation or opening of the discharge valve is performed based on information on an upper position of a solid component detected by the interface position detector Adjust the control department. 如申請專利範圍第15至18項中任一項之固液分離裝置,其係具備:以當前述界面位置檢測器所檢測之固 體成分的上面位置上升至前述污泥罐內的第1既定高度時,開啟前述排出閥以排出前述污泥罐內的固體成分,並且當由於前述固體成分的排出使前述界面位置檢測器所檢測之固體成分的上面位置下降至前述污泥罐內的第2既定高度時,關閉前述排出閥之方式進行控制之控制部。 The solid-liquid separation device according to any one of claims 15 to 18, wherein the solid-liquid separation device has a solidity detected by the interface position detector When the upper position of the body component rises to the first predetermined height in the sludge tank, the discharge valve is opened to discharge the solid content in the sludge tank, and is detected by the interface position detector due to the discharge of the solid component. When the upper position of the solid component falls to the second predetermined height in the sludge tank, the control unit that controls the discharge valve is closed. 如申請專利範圍第15至18項中任一項之固液分離裝置,其係具備:以當前述界面位置檢測器所檢測之固體成分的上面位置下降時,減少前述排出閥的開放度,當前述界面位置檢測器所檢測之固體成分的上面位置上升時,增大前述排出閥的開放度之方式進行控制,藉此將前述污泥罐內之固體成分的上面位置控制在大致一定的位置之控制部。 The solid-liquid separation device according to any one of claims 15 to 18, wherein when the upper position of the solid component detected by the interface position detector is lowered, the opening degree of the discharge valve is reduced. When the position of the upper surface of the solid component detected by the interface position detector increases, the opening degree of the discharge valve is increased to control the upper position of the solid component in the sludge tank to a substantially constant position. Control department.
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