TW201435410A - 光通訊模組組裝裝置 - Google Patents

光通訊模組組裝裝置 Download PDF

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Publication number
TW201435410A
TW201435410A TW102108140A TW102108140A TW201435410A TW 201435410 A TW201435410 A TW 201435410A TW 102108140 A TW102108140 A TW 102108140A TW 102108140 A TW102108140 A TW 102108140A TW 201435410 A TW201435410 A TW 201435410A
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TW
Taiwan
Prior art keywords
communication module
optical communication
lens unit
module assembly
nozzle
Prior art date
Application number
TW102108140A
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English (en)
Inventor
Chih-Chen Lai
Original Assignee
Hon Hai Prec Ind Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hon Hai Prec Ind Co Ltd filed Critical Hon Hai Prec Ind Co Ltd
Priority to TW102108140A priority Critical patent/TW201435410A/zh
Priority to US13/928,164 priority patent/US20140250682A1/en
Publication of TW201435410A publication Critical patent/TW201435410A/zh

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/68Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
    • H01L21/681Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment using optical controlling means
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67121Apparatus for making assemblies not otherwise provided for, e.g. package constructions
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/24Coupling light guides
    • G02B6/42Coupling light guides with opto-electronic elements
    • G02B6/4201Packages, e.g. shape, construction, internal or external details
    • G02B6/4204Packages, e.g. shape, construction, internal or external details the coupling comprising intermediate optical elements, e.g. lenses, holograms
    • G02B6/4214Packages, e.g. shape, construction, internal or external details the coupling comprising intermediate optical elements, e.g. lenses, holograms the intermediate optical element having redirecting reflective means, e.g. mirrors, prisms for deflecting the radiation from horizontal to down- or upward direction toward a device
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/24Coupling light guides
    • G02B6/42Coupling light guides with opto-electronic elements
    • G02B6/4201Packages, e.g. shape, construction, internal or external details
    • G02B6/4219Mechanical fixtures for holding or positioning the elements relative to each other in the couplings; Alignment methods for the elements, e.g. measuring or observing methods especially used therefor
    • G02B6/422Active alignment, i.e. moving the elements in response to the detected degree of coupling or position of the elements
    • G02B6/4221Active alignment, i.e. moving the elements in response to the detected degree of coupling or position of the elements involving a visual detection of the position of the elements, e.g. by using a microscope or a camera
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/24Coupling light guides
    • G02B6/42Coupling light guides with opto-electronic elements
    • G02B6/4201Packages, e.g. shape, construction, internal or external details
    • G02B6/4219Mechanical fixtures for holding or positioning the elements relative to each other in the couplings; Alignment methods for the elements, e.g. measuring or observing methods especially used therefor
    • G02B6/422Active alignment, i.e. moving the elements in response to the detected degree of coupling or position of the elements
    • G02B6/4225Active alignment, i.e. moving the elements in response to the detected degree of coupling or position of the elements by a direct measurement of the degree of coupling, e.g. the amount of light power coupled to the fibre or the opto-electronic element
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2933/00Details relating to devices covered by the group H01L33/00 but not provided for in its subgroups
    • H01L2933/0008Processes
    • H01L2933/0033Processes relating to semiconductor body packages
    • H01L2933/0058Processes relating to semiconductor body packages relating to optical field-shaping elements
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00Metal working
    • Y10T29/53Means to assemble or disassemble
    • Y10T29/53022Means to assemble or disassemble with means to test work or product

Abstract

一種光通訊模組組裝裝置,用來將透鏡單元組裝到基板上,所述基板上設置有發光元件,所述光通訊模組組裝裝置包括吸嘴、驅動單元和功率計,所述吸嘴用來吸取所述透鏡單元並將所述透鏡單元貼合到所述基板上,所述驅動單元用來驅動所述吸嘴,所述功率計設置在所述吸嘴上,所述發光元件發出的光線經過所述透鏡單元被所述功率計接收。

Description

光通訊模組組裝裝置
本發明系關於一種光通訊模組,尤其是一種光通訊模組組裝裝置。
光通訊模組一般包括基板、設置於基板上的電子元件(包括發光元件和光接收元件)及透鏡單元,電子元件通過透鏡單元收發光線,也就是說電子元件需與透鏡單元進行光耦合。
目前,電子元件主要通過導電膠黏結並電性連接在基板上,透鏡單元同樣通過膠水並藉助基板上的定位結構固定在基板上以實現與電子元件的光耦合。然而,透鏡單元的黏結過程中僅僅藉助定位結構,透鏡單元與電子元件之間是否精確對準並無法知曉而常常導致產品不良,致使組裝良率低下。
有鑑於此,有必要提供一種提高組裝良率的光通訊模組組裝裝置。
一種光通訊模組組裝裝置,用來將透鏡單元組裝到基板上,所述基板上設置有發光元件,所述光通訊模組組裝裝置包括吸嘴、驅動單元和功率計,所述吸嘴用來吸取所述透鏡單元並將所述透鏡單元貼合到所述基板上,所述驅動單元用來驅動所述吸嘴,所述功率計設置在所述吸嘴上,所述發光元件發出的光線經過所述透鏡單元被所述功率計接收。
相較於先前技術,本實施例的光通訊模組組裝裝置的吸嘴上設置功率計,利用功率計檢測發光元件發出的光功率,以判斷透鏡單元與發光元件之間的耦合度,從而提升了將透鏡單元貼附到基板上的組裝良率。
10...光通訊模組組裝裝置
11...來料盤
12...第一影像感測器
13...吸嘴
130...吸嘴頭
14...功率計
15...驅動單元
16...目的盤
17...第二影像感測器
20...透鏡單元
21...第一透鏡
22...第二透鏡
23...反射面
30...基板
40...發光元件
圖1是本發明實施例光通訊模組組裝裝置的平面示意圖。
圖2是本發明實施例光通訊模組組裝裝置將透鏡單元放置在基板上的示意圖。
請參閱圖1及圖2,本發明實施例提供的光通訊模組組裝裝置10用來將透鏡單元20組裝到基板30上,基板30上電性設置有發光元件40,透鏡單元20與發光元件40耦合以傳輸發光元件40發出的光線。發光元件40可以為發光二極體(light-emitting diode,LED)或鐳射二極體(laser diode,LD)。基板30可以為電路板,例如,硬質電路板或柔性電路板。
光通訊模組組裝裝置10包括來料盤11、第一影像感測器12、吸嘴13、功率計14、驅動單元15、目的盤16和第二影像感測器17。
來料盤11用來承載複數透鏡單元20,每一個透鏡單元20均具有數量相同的第一透鏡21和第二透鏡22以及一個反射面23,第一透鏡21的光軸與第二透鏡22的光軸垂直相交於反射面23上,並且第一透鏡21朝向來料盤11。第一影像感測器12設置在來料盤11上方並朝向透鏡單元20以用來拍攝透鏡單元20的圖像以辨識透鏡單元20在來料盤11上的位置以及透鏡單元20的輪廓,從而可輔助吸嘴13準確吸取透鏡單元20。第一影像感測器12可採用電荷耦合裝置(charge-coupled device,CCD)或互補性金屬氧化物半導體(complementary metal-oxide semiconductor,CMOS)。
吸嘴13用來從來料盤11上吸取透鏡單元20並移動透鏡單元20至目的盤16上方。吸嘴13具有一個吸嘴頭130,吸嘴頭130開設有與真空源(圖未示)連通的開口並且吸嘴頭130朝向透鏡單元20。吸嘴13一般採用不鏽鋼材料製成,而爲了不損傷透鏡單元20,可在吸嘴頭130上貼附柔性材料,例如,橡膠。
功率計14設置在吸嘴13的吸嘴頭130上並朝向透鏡單元20的第二透鏡22,換言之,第二透鏡22的光軸基本垂直功率計14的受光面。功率計14為可檢測到所接收光線的光功率大小的電子元件,例如,光電檢測器。
驅動單元15與吸嘴13相連以用來驅動吸嘴13上下、前後、左右等方向移動以改變吸嘴13相對來料盤11和目的盤16的位置。
目的盤16上承載有複數基板30,發光元件40電性設置在基板30上。第二影像感測器17設置在目的盤16的上方並朝向基板30用於拍攝基板30的圖像,以辨識基板30和發光元件40的位置及輪廓,以輔助吸嘴13準確將每個透鏡單元20貼附到對應的基板30上。
驅動單元15驅動吸嘴13移動至來料盤11上的透鏡單元20上方並使吸嘴13吸取透鏡單元20,吸嘴13吸取透鏡單元20後,驅動單元15繼續驅動吸嘴13移動到目的盤16的上方,結合第二影像感測器17將透鏡單元20放置在基板30上,此時,使發光元件40發出光線,如果透鏡單元20放置到位,發光元件40發出的光線會經過第一透鏡21入射到反射面23上、反射後入射到第二透鏡22上,從第二透鏡22出射後然後被設置在吸嘴13上的功率計14接收,反之,如果透鏡單元20沒有放置到位則功率計14不會接收到光線。相對發光元件40前後、左右、上下移動吸嘴13以改變透鏡單元20相對發光元件40的位置,直至功率計14檢測到最大的光功率,此位置為透鏡單元20與發光元件40之間最佳的貼合位置,將透鏡單元20放置在基板30上從而完成透鏡單元20與發光元件40之間的耦合。
光通訊模組組裝裝置10利用功率計14檢測接收到的光功率,以判斷透鏡單元20與發光元件40之間的耦合度,從而提升了將透鏡單元20貼附到基板30上的組裝良率。
綜上所述,本發明確已符合發明專利之要件,遂依法提出專利申請。惟,以上所述者僅為本發明之較佳實施方式,自不能以此限制本案之申請專利範圍。舉凡熟悉本案技藝之人士爰依本發明之精神所作之等效修飾或變化,皆應涵蓋於以下申請專利範圍內。
10...光通訊模組組裝裝置
11...來料盤
12...第一影像感測器
13...吸嘴
130...吸嘴頭
14...功率計
15...驅動單元
16...目的盤
17...第二影像感測器
20...透鏡單元
21...第一透鏡
22...第二透鏡
23...反射面
30...基板
40...發光元件

Claims (10)

  1. 一種光通訊模組組裝裝置,用來將透鏡單元組裝到基板上,所述基板上設置有發光元件,所述光通訊模組組裝裝置包括吸嘴、驅動單元和功率計,所述吸嘴用來吸取所述透鏡單元並將所述透鏡單元貼合到所述基板上,所述驅動單元用來驅動所述吸嘴,所述功率計設置在所述吸嘴上,所述發光元件發出的光線經過所述透鏡單元被所述功率計接收。
  2. 如請求項1所述的光通訊模組組裝裝置,其中,所述吸嘴包括吸嘴頭用來真空吸取所述透鏡單元。
  3. 如請求項1所述的光通訊模組組裝裝置,其中,所述發光元件為發光二極體或鐳射二極體。
  4. 如請求項2所述的光通訊模組組裝裝置,其中,所述吸嘴頭上設置有柔性材料。
  5. 如請求項2所述的光通訊模組組裝裝置,其中,所述功率計設置在所述吸嘴頭上。
  6. 如請求項1所述的光通訊模組組裝裝置,其中,所述光通訊模組組裝裝置還包括來料盤和第一影像感測器,所述來料盤用來承載所述透鏡單元,所述第一影像感測器用來拍攝所述透鏡單元的圖像以輔助所述吸嘴準確從所述來料盤上吸取所述透鏡單元。
  7. 如請求項6所述的光通訊模組組裝裝置,其中,所述光通訊模組組裝裝置還包括目的盤和第二影像感測器,所述目的盤用於承載多個基板,所述第二影像感測器用來拍攝所述基板的圖像以輔助所述吸嘴將所述透鏡單元準確貼附到所述基板上。
  8. 如請求項1所述的光通訊模組組裝裝置,其中,所述基板為電路板。
  9. 如請求項8所述的光通訊模組組裝裝置,其中,所述基板為硬質電路板或柔性電路板。
  10. 如請求項9所述的光通訊模組組裝裝置,其中,所述功率計為光電檢測器。
TW102108140A 2013-03-07 2013-03-07 光通訊模組組裝裝置 TW201435410A (zh)

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TW102108140A TW201435410A (zh) 2013-03-07 2013-03-07 光通訊模組組裝裝置
US13/928,164 US20140250682A1 (en) 2013-03-07 2013-06-26 Device for assembling lens element on substrate

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TW102108140A TW201435410A (zh) 2013-03-07 2013-03-07 光通訊模組組裝裝置

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US20140082935A1 (en) * 2012-09-27 2014-03-27 Volex Plc Method for passive alignment of optical components to a substrate
JP6171679B2 (ja) * 2013-07-29 2017-08-02 住友電気工業株式会社 レンズ部品および光モジュール
WO2018045304A1 (en) * 2016-09-01 2018-03-08 Luxtera, Inc. Method and system for optical alignment to a silicon photonically-enabled integrated circuit
CN111571188A (zh) * 2019-02-15 2020-08-25 宁波舜宇光电信息有限公司 一种自动扣料系统及方法
CN110133808B (zh) * 2019-05-23 2020-12-04 深圳市易飞扬通信技术有限公司 多模光模块耦合方法和系统
TWI733618B (zh) * 2020-11-12 2021-07-11 佳必琪國際股份有限公司 光模組的耦光方法
CN114578493A (zh) * 2020-12-01 2022-06-03 佳必琪国际股份有限公司 光模块的耦光方法

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JPH08162797A (ja) * 1994-12-08 1996-06-21 Matsushita Electric Ind Co Ltd 電子部品実装装置
JP2002204096A (ja) * 2000-12-28 2002-07-19 Fuji Mach Mfg Co Ltd 電気部品装着システムおよび電気部品装着方法
KR20060026883A (ko) * 2003-07-09 2006-03-24 가부시키가이샤 니콘 결합장치, 노광장치 및 디바이스 제조방법

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