TW201412496A - Method for producing film roll - Google Patents

Method for producing film roll Download PDF

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Publication number
TW201412496A
TW201412496A TW102117200A TW102117200A TW201412496A TW 201412496 A TW201412496 A TW 201412496A TW 102117200 A TW102117200 A TW 102117200A TW 102117200 A TW102117200 A TW 102117200A TW 201412496 A TW201412496 A TW 201412496A
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Taiwan
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film
thickness
profile
measurement
measured
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TW102117200A
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Chinese (zh)
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TWI616309B (en
Inventor
Koji Koyama
Kazuhiko Hatakeyama
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Sumitomo Chemical Co
Escarbo Sheet Co Ltd
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29DPRODUCING PARTICULAR ARTICLES FROM PLASTICS OR FROM SUBSTANCES IN A PLASTIC STATE
    • B29D7/00Producing flat articles, e.g. films or sheets
    • B29D7/01Films or sheets
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29CSHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C48/00Extrusion moulding, i.e. expressing the moulding material through a die or nozzle which imparts the desired form; Apparatus therefor
    • B29C48/25Component parts, details or accessories; Auxiliary operations
    • B29C48/30Extrusion nozzles or dies
    • B29C48/305Extrusion nozzles or dies having a wide opening, e.g. for forming sheets
    • B29C48/31Extrusion nozzles or dies having a wide opening, e.g. for forming sheets being adjustable, i.e. having adjustable exit sections
    • B29C48/313Extrusion nozzles or dies having a wide opening, e.g. for forming sheets being adjustable, i.e. having adjustable exit sections by positioning the die lips
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29CSHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C48/00Extrusion moulding, i.e. expressing the moulding material through a die or nozzle which imparts the desired form; Apparatus therefor
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29CSHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C48/00Extrusion moulding, i.e. expressing the moulding material through a die or nozzle which imparts the desired form; Apparatus therefor
    • B29C48/03Extrusion moulding, i.e. expressing the moulding material through a die or nozzle which imparts the desired form; Apparatus therefor characterised by the shape of the extruded material at extrusion
    • B29C48/07Flat, e.g. panels
    • B29C48/08Flat, e.g. panels flexible, e.g. films
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29CSHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C48/00Extrusion moulding, i.e. expressing the moulding material through a die or nozzle which imparts the desired form; Apparatus therefor
    • B29C48/25Component parts, details or accessories; Auxiliary operations
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29CSHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C48/00Extrusion moulding, i.e. expressing the moulding material through a die or nozzle which imparts the desired form; Apparatus therefor
    • B29C48/25Component parts, details or accessories; Auxiliary operations
    • B29C48/92Measuring, controlling or regulating
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29CSHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C2948/00Indexing scheme relating to extrusion moulding
    • B29C2948/92Measuring, controlling or regulating
    • B29C2948/92009Measured parameter
    • B29C2948/92114Dimensions
    • B29C2948/92152Thickness
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29CSHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C2948/00Indexing scheme relating to extrusion moulding
    • B29C2948/92Measuring, controlling or regulating
    • B29C2948/92009Measured parameter
    • B29C2948/92114Dimensions
    • B29C2948/92171Distortion, shrinkage, dilatation, swell or warpage
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29CSHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C2948/00Indexing scheme relating to extrusion moulding
    • B29C2948/92Measuring, controlling or regulating
    • B29C2948/92323Location or phase of measurement
    • B29C2948/92447Moulded article
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29CSHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C2948/00Indexing scheme relating to extrusion moulding
    • B29C2948/92Measuring, controlling or regulating
    • B29C2948/92504Controlled parameter
    • B29C2948/92523Force; Tension
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29CSHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C2948/00Indexing scheme relating to extrusion moulding
    • B29C2948/92Measuring, controlling or regulating
    • B29C2948/92504Controlled parameter
    • B29C2948/92609Dimensions
    • B29C2948/92647Thickness
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29CSHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C2948/00Indexing scheme relating to extrusion moulding
    • B29C2948/92Measuring, controlling or regulating
    • B29C2948/92504Controlled parameter
    • B29C2948/92609Dimensions
    • B29C2948/92666Distortion, shrinkage, dilatation, swell or warpage

Abstract

The present invention relates to a method for producing a film roll with good appearance without using oscillations means, there is provided with a method for manufacturing the film roll, characterized by comprising: a film forming step (A) which extrudes thermoplastic resin from an adjusting means having a lip gap, and moves the film while making the film; a thickness adjusting step (B) for adjusting the film thickness during the transitional movement of the film; a step of rolling the film into a roll shape (C). In step (B), the film thickness is adjusted by repeating the following steps of (a) to (c): (a) a step of measuring the film thickness at specific intervals in the width direction of the film to produce respective thickness profiles; (b) a step of producing the measurement thickness profile based one or more of the respective thickness profiles; (c) a step of adjusting the lip gap based on the measurement thickness profile and the preset thickness profile. Also, the film is subjected to thickness adjustment again in a manner of meeting the following conditions respectively: R1 ≤ 2.0 μm, σ1 ≤ 0.5 μm, RAV ≤ 1.0 μm, and σAV ≤ 0.2 μm, where R1 denoted as the amplitude of the film thickness in a measurement thickness profile, σ1 as standard deviation of the film thickness in a measurement thickness profile, RAV as amplitude of the film thickness in the cumulative average profiles, and σAV as standard deviation of the film thickness in the cumulative average profiles.

Description

薄膜卷材之製造方法 Film coil manufacturing method

本發明係關於薄膜卷材之製造方法,尤其關於藉由將由熱可塑性樹脂所構成之薄膜捲成捲筒狀而形成的薄膜卷材之製造方法。 The present invention relates to a method for producing a film web, and more particularly to a method for producing a film web formed by winding a film made of a thermoplastic resin into a roll.

由聚酯、聚丙烯、聚碳酸酯、聚甲基丙烯酸甲酯(PMMA)等之熱可塑性樹脂所構成之薄膜,例如在液晶顯示裝置或電漿顯示器等之平面顯示器中,當作光擴散膜或用以保護平面顯示器之構成構件之表面的保護膜等使用。 A film made of a thermoplastic resin such as polyester, polypropylene, polycarbonate, or polymethyl methacrylate (PMMA), for example, as a light diffusing film in a flat panel display such as a liquid crystal display device or a plasma display device Or a protective film or the like for protecting the surface of the constituent member of the flat display.

再者,被安裝於液晶顯示裝置之液晶面板中,也有例如配置偏光板之情況,如此之偏光板係在偏光子之兩面,疊層由上述之熱可塑性樹脂所構成之保護膜而構成,又在該保護膜之至少一方之表面又設置防眩層或硬塗層等。 Further, in the liquid crystal panel of the liquid crystal display device, for example, a polarizing plate is disposed, and such a polarizing plate is formed on both surfaces of the polarizer, and a protective film composed of the above thermoplastic resin is laminated, and An anti-glare layer, a hard coat layer, or the like is further provided on at least one surface of the protective film.

再者,例如,在上述構成之偏光板中,當在由熱可塑性樹脂所構成之保護膜具有厚度不均時(即是,厚度不均勻),如此之保護膜有容易剝離,當被放置在重複高溫和低溫之環境下時容易產生裂紋之情形,薄膜之商 品價值明顯受到損害。因此,在如此的由熱可塑性樹脂所構成之薄膜之製造工程中,要求將與薄膜之縱向(或是製造生產線中之薄膜的移行方向或搬運方向)正交之薄膜之寬方向之薄膜厚度之分布設在特定範圍內。例如,要求以在薄膜之全寬上薄膜厚度均勻之方式來控制薄膜厚度。該薄膜厚度之寬方向之調整係藉由被設置在具有模具之特定寬度之模唇的厚度調整手段而被實施,且上述模具係被用於擠壓成形熔融的熱可塑性樹脂,一般而言,為可以調整熔化聚合物通過之模唇之縫隙狀間隙的螺栓,或是由如此之螺栓,和可以加熱該螺栓之加熱器等所構成的手段(例如,熱螺栓方式之致動器等)。再者,模唇之間隙可以使用各被設置在以特定間隔被設置在模唇之寬方向之複數區間的螺栓,而在各區間獨立調整。再者,如此之模唇之間隙的調整也有自動化之情況。 Further, for example, in the polarizing plate having the above configuration, when the protective film composed of the thermoplastic resin has uneven thickness (that is, the thickness is not uniform), such a protective film is easily peeled off when placed in When cracking in high temperature and low temperature environments, cracks are likely to occur. The value of the goods is obviously damaged. Therefore, in the manufacturing process of such a film composed of a thermoplastic resin, it is required to have a film thickness in the width direction of the film orthogonal to the longitudinal direction of the film (or the traveling direction or the conveying direction of the film in the production line). The distribution is set within a specific range. For example, it is desirable to control the film thickness in a manner that the film thickness is uniform over the full width of the film. The adjustment of the width direction of the film thickness is carried out by a thickness adjusting means provided on a lip having a specific width of the mold, and the above mold is used for extrusion molding a molten thermoplastic resin, in general, It is a bolt which can adjust the slit-like gap of the lip through which the molten polymer passes, or a means such as a bolt and a heater which can heat the bolt (for example, an actuator of a hot bolt type, etc.). Further, the gap between the lips can be independently adjusted in each section by using bolts each provided in a plurality of sections provided at a specific interval in the width direction of the lip. Moreover, the adjustment of the gap between such a lip is also automated.

使用如此之厚度調整手段而被調整之薄膜之寬方向之厚度,一般係在薄膜被捲成捲筒狀之期間藉由厚度測量器而被測量,其測量值係被反饋至上述調整手段,然後,又重複進行薄膜寬方向之厚度的均勻化之調整,即進行所謂的反饋控制。 The thickness in the width direction of the film which is adjusted by using such a thickness adjustment means is generally measured by a thickness measuring device while the film is wound into a roll shape, and the measured value is fed back to the above-mentioned adjusting means, and then Further, the adjustment of the uniformity of the thickness in the width direction of the film is repeated, that is, so-called feedback control is performed.

在以上述厚度測量值為基準之薄膜厚度之調整方法中,雖然可藉由使用該調整方法,將薄膜之厚度在薄膜之寬方向,根據至少一次從其一方之端部掃描(scan)至另一方之端部而測量薄膜厚度所製作的測量厚度剖面,並藉由上述反饋控制,實施薄膜之寬方向之厚度 的均勻化,但是在最終的薄膜卷材製品之表面外觀,以產生被稱為暴筋(gauge band)的沿著薄膜之縱向(或是捲繞方向)的凸部,或被稱為金字塔((pyramid)之不良情形為多。 In the method for adjusting the thickness of the film based on the thickness measurement, the thickness of the film can be scanned from one end to the other at least once by using the adjustment method in the width direction of the film. Measuring the thickness profile made by measuring the film thickness at the end of one side, and performing thickness control in the width direction of the film by the above feedback control Homogenization, but at the surface appearance of the final film web product, to create a convex portion called the gauge band along the longitudinal direction (or winding direction) of the film, or called a pyramid ( (pyramid) has many bad situations.

在此,「暴筋」也被稱為昆布卷、活塞環等,該係指於將薄膜捲成捲筒狀之時,在薄膜卷材之一部分產生於捲繞方向的帶狀缺陷(凸部)。該缺陷係在薄膜之寬方向中之薄膜的厚度中,由於僅些許薄膜之厚度大的部分被捲在輥而累積在捲繞方向而產生。如此一來,暴筋係由於薄膜卷材製作時之卷徑差的原因而產生。 Here, the "burst" is also referred to as a kelp roll, a piston ring, or the like, and refers to a band-shaped defect (protrusion) which is generated in a winding direction in one portion of the film roll when the film is wound into a roll shape. ). This defect is caused by the thickness of the film in the width direction of the film, since only a part of the film having a large thickness is wound on the roll and accumulated in the winding direction. As a result, the ribs are caused by the difference in the winding diameter of the film web.

再者,「金字塔」也被稱為皺摺、多角形化等,為成為上述暴筋之前的現象,該係在卷材表面微細的凹凸連成帶狀而形成。 In addition, the "pyramid" is also called a wrinkle, a polygonal shape, and the like, and is formed in a strip shape in which fine concavities and convexities on the surface of the web are formed in a strip shape.

如此之缺陷雙方皆因為在以又對樹脂薄膜上進行的硬塗處理、低反射(AR)處理、防眩(AG)處理等之表面處理等所代表的後加工之各處理工程中,在薄膜上引起目視上之缺陷,故如此薄膜卷材中之上述缺陷的任一者在薄膜之品質上皆強烈被要求其改善。 Both of the defects are in the respective processing works of the post-processing represented by the hard coating treatment, the low-reflection (AR) treatment, the anti-glare (AG) treatment, and the like on the resin film. Any of the above defects in the film web are strongly required to be improved in the quality of the film.

並且,上述之厚度調整手段中,雖然根據測量厚度剖面,進行對調整手段的反饋控制,但是成為此時之基準的目標值,係薄膜寬方向之均勻厚度分布(該也被稱為期待厚度剖面)。 Further, in the thickness adjustment means described above, the feedback control of the adjustment means is performed based on the measurement of the thickness profile, but the target value at the time of the reference is a uniform thickness distribution in the width direction of the film (this is also called the expected thickness profile). ).

因此,例如於測量厚度剖面之一區間之薄膜厚度(即是,在薄膜之寬方向上設定的特定區間中之薄膜的厚度) 大於目標值之時,為了抑制從相當於其區間之模具吐出熔化聚合物之吐出量,進行在其區間縮小模唇之間隙的調整。 Therefore, for example, the thickness of the film in one of the sections of the thickness profile is measured (that is, the thickness of the film in a specific section set in the width direction of the film) When it is larger than the target value, in order to suppress the discharge amount of the molten polymer discharged from the mold corresponding to the section, the adjustment of the gap in which the lip is reduced in the section is performed.

然後,之後也一面重複同樣的調整,一面進行薄膜之厚度的調整,至最終在薄膜之寬方向取得均勻厚度為止。 Then, the thickness of the film is adjusted while repeating the same adjustment, and finally a uniform thickness is obtained in the width direction of the film.

但是,此時,將在調整吐出量之期間所製作的測量厚度剖面中之該部分(或區間)之薄膜厚度相加平均而取得的累計厚度(即是,薄膜之縱向之厚度的累計值之平均值)仍較其目標值厚。 However, at this time, the cumulative thickness obtained by adding and averaging the film thicknesses of the portions (or sections) in the measured thickness profile produced during the adjustment of the discharge amount (that is, the cumulative value of the thickness of the longitudinal direction of the film) The average) is still thicker than its target value.

即是,在該部分之累計厚度相對於其目標值成為+側之數值,其結果,產生暴筋或金字塔等之缺陷的原因仍然無法排除。 That is, the cumulative thickness of the portion becomes a value on the + side with respect to the target value, and as a result, the cause of defects such as ribs or pyramids cannot be excluded.

如此一來,在以往之厚度調整手段中,因針對與薄膜之累計厚度有關之要素,完全無考慮到,故要有效地抑制薄膜卷材中之暴筋或金字塔等之缺陷,並取得外觀之良好的薄膜卷材則有困難。 As a result, in the conventional thickness adjustment means, since the elements relating to the cumulative thickness of the film are not considered at all, it is necessary to effectively suppress defects such as ribs or pyramids in the film web, and to obtain an appearance. Good film coils have difficulties.

對此,就以以往技術而言,提案有下述方法:例如一面在薄膜和用以捲取薄膜之芯體之間以一定週期進行芯體之軸方向之相對性往返運動(振盪機構),一面捲取薄膜之方法(參照專利文獻1等)。 In view of this, in the prior art, there has been proposed a method in which, for example, a relative reciprocating motion (oscillation mechanism) of the axial direction of the core is performed between the film and the core for winding the film at a certain period, A method of winding a film (see Patent Document 1, etc.).

屬於暫時將薄膜捲在中間輥,之後從中間輥卷出薄膜,一面施加振盪一面切成所需之寬度,並再次捲成捲筒狀,製造出最終的薄膜卷材之方法,其係根據捲在中間輥之前的薄膜寬方向之厚度分布,預測最終之薄膜卷材之卷 形狀,並根據所預測之最終的卷形狀,控制模具中之吐出量的方法(參照專利文獻2等)。 It is a method of temporarily winding a film on an intermediate roll, then winding the film from the intermediate roll, cutting it into a desired width while applying vibration, and winding it into a roll shape to produce a final film roll. Thickness distribution in the width direction of the film before the intermediate roll, predicting the final roll of the film roll The shape and the method of controlling the discharge amount in the mold based on the predicted final roll shape (see Patent Document 2, etc.).

屬於邊從捲取薄膜之中間輥捲回薄膜,分條(切割)成複數之特定製品寬度而製造出製品卷材的薄膜卷材之製造方法,其係測量中間輥之寬方向之卷徑分布,根據其測量值而以所決定之振盪條件使中間輥移動(振盪)至軸方向,邊以分條製造出製品卷材之方法(參照專利文獻3等)。 The invention relates to a method for manufacturing a film web which is obtained by winding a film from an intermediate roll of a film, and slitting (cutting) a plurality of specific product widths to produce a product roll, which measures the roll diameter distribution of the width direction of the intermediate roll. A method in which the intermediate roll is moved (oscillated) to the axial direction by the oscillating condition determined by the measured value, and the product coil is produced by striping (see Patent Document 3, etc.).

為一種薄膜之捲取方法,係屬於在測量延伸薄膜之寬方向之厚度分布,根據其測量值,控制從模具吐出之吐出量,而邊將薄膜之寬方向中之厚度分布控制成特定之剖面,邊將薄膜捲成捲筒狀之方法,其特徵為:測量薄膜卷材之寬方向之卷徑分布,從其卷徑分布值預測捲取後之薄膜卷材之卷形狀,並根據該預測值,調整自模具吐出之吐出量,而將薄膜卷材之卷形狀控制成目標的卷形狀(參照專利文獻4等)。 The method for winding a film belongs to measuring the thickness distribution in the width direction of the stretched film, and according to the measured value, controlling the discharge amount discharged from the mold, while controlling the thickness distribution in the width direction of the film to a specific profile. a method for winding a film into a roll shape, characterized in that: measuring a roll diameter distribution in a width direction of the film roll, predicting a roll shape of the film roll after winding from a roll diameter distribution value, and based on the prediction The value is adjusted to the amount of discharge from the mold, and the roll shape of the film roll is controlled to the target roll shape (see Patent Document 4, etc.).

〔先前技術文獻〕 [Previous Technical Literature] 〔專利文獻〕 [Patent Document]

[專利文獻1]日本公昭36-22875號公報 [Patent Document 1] Japanese Patent Publication No. 36-22875

[專利文獻2]日本特開2002-28972號公報 [Patent Document 2] Japanese Patent Laid-Open Publication No. 2002-28972

[專利文獻3]日本特開2002-87690號公報 [Patent Document 3] Japanese Patent Laid-Open Publication No. 2002-87690

[專利文獻4]日本特開2001-30339號公報 [Patent Document 4] Japanese Patent Laid-Open Publication No. 2001-30339

但是,記載於專利文獻1之發明,除了於以捲取部進行搖動(振盪)之時,有薄膜不受均勻之捲取張力,而產生皺紋之虞外,所捲取之薄膜卷材之端面無均勻對齊,由於即使在後工程也需要EPC(邊緣位置控制)機構等,故在品質上、設備上之問題為多。 However, in the invention described in Patent Document 1, when the film is shaken (oscillated) by the winding portion, the film is not subjected to uniform winding tension, and wrinkles are generated, and the end face of the wound film roll is wound. There is no uniform alignment, and since EPC (Edge Position Control) mechanism or the like is required even in the post-engineering, there are many problems in terms of quality and equipment.

再者,在專利文獻1中,為了將卷材端面較均勻地對齊,雖然也實施對製品寬進行分條(切割)及振盪,但是因需要放大搖動寬部分的有效寬度,故必須將薄膜生產設備規模設定成較大,在成本上有大的問題。 Further, in Patent Document 1, in order to uniformly align the end faces of the coils, slitting (cutting) and oscillation of the width of the product are also performed, but since it is necessary to enlarge the effective width of the wide portion of the shake, it is necessary to produce the film. The scale of the device is set to be large, and there is a big problem in cost.

再者,記載於專利文獻2、3之發明針對中間輥,即是在薄膜製造工程內所用之輥上的捲繞外觀,並無詳細記載,只不過係關於實施振盪後之最終卷材製品的捲繞外觀。如上述般,效率隨著實施振盪而下降,並且在該方法中,因另外需要從中間輥回朝最終製品卷材的捲回(換捲)或分條工程,故時間上、人力負擔大,稱不上有效率。 Further, the inventions described in Patent Documents 2 and 3 are directed to the intermediate roll, that is, the wound appearance on the roll used in the film production process, and are not described in detail, but are related to the final roll product after the oscillation is performed. Winding appearance. As described above, the efficiency decreases as the oscillation is performed, and in this method, since it is additionally required to be retracted (replaced) or slitted from the intermediate roll toward the final product coil, time and labor burden are large. Can't be said to be efficient.

記載於專利文獻4之發明,由於直接測量實際之薄膜卷材之卷徑分布,故可以將薄膜卷材之外觀精加工成良好,但是由於捲取薄膜卷材之時的捲取設備之振動或捲取軸之軸搖晃等之設備引起的測量誤差,有使捲繞外觀受損之虞。再者,也預測由於追加卷徑分布之測量器,或導入用以對所測量之卷徑分布進行反饋控制之新增軟 體,或配線連接等,需花費較大的成本。 According to the invention of Patent Document 4, since the roll diameter distribution of the actual film web is directly measured, the appearance of the film web can be finished to be good, but the vibration of the winding device at the time of winding the film web or The measurement error caused by the equipment such as the shaft of the take-up shaft is shaken, and the appearance of the winding is damaged. Furthermore, it is also predicted that the measurer due to the additional roll diameter distribution or the newly added soft control for feedback control of the measured roll diameter distribution Body, or wiring connections, etc., cost a lot.

於是,本發明係以提供不利用振盪,製造出外觀良好之薄膜卷材為目的。 Accordingly, the present invention has an object of providing a film web having a good appearance without using oscillation.

本發明者為了解決上述課題,深入研究結果,找出由以下構成所形成的解決手段,而完成本發明。 In order to solve the above problems, the inventors of the present invention have intensively studied the results and found a solution formed by the following constitution to complete the present invention.

因此,本發明雖然係提供以下之製造方法,但本發明並不限定於以下之方法。 Therefore, although the present invention provides the following production methods, the present invention is not limited to the following methods.

[1]為一種薄膜卷材之製造方法,包含以下之工程(A)~(C):(A)從具備唇部間隙(lip gap)之調整手段的模具擠壓熱可塑性樹脂,且邊移行邊製膜,而形成薄膜之工程;(B)在該薄膜之移行中,調整該薄膜之厚度的工程,重複下述之步驟(a)~(c),而調整薄膜之厚度的工程,(a)在與該薄膜之移行方向正交之該薄膜之寬方向,以特定間隔測量該移行中之薄膜的厚度,製作個別厚度剖面之步驟,(b)根據一個或其以上之該個別厚度剖面,製作測量厚度剖面之步驟,(c)根據該測量厚度剖面,和設定厚度剖面,調整 該模具之唇部間隙之步驟;(C)將薄膜捲成捲筒狀之工程,在該工程(B)中,以滿足下述之條件之方式,又調整薄膜之厚度,R1≦2.0μm,σ1≦0.5μm,RAV≦1.0μm,及σAV≦0.2μm,[式中,R1係一次之該測量厚度剖面中之薄膜厚度之最大值和最小值之差,表示該測量厚度剖面中之薄膜厚度之振幅,σ1係表示一次之該測量厚度剖面中之薄膜厚度之標準偏差,RAV係表示100次連續製作該測量厚度剖面而相加平均所取得之累計平均剖面中之薄膜厚度之最大值和最小值之差,表示該累計平均剖面中之薄膜厚度的振幅,σAV係表示該累計平均剖面中之薄膜厚度之標準偏差]。 [1] A method for producing a film web comprising the following items (A) to (C): (A) extruding a thermoplastic resin from a mold having an adjustment means of a lip gap, and moving while moving (B) the process of adjusting the thickness of the film during the migration of the film, repeating the following steps (a) to (c), and adjusting the thickness of the film, a) measuring the thickness of the film in the transition at a specific interval in the width direction of the film orthogonal to the direction of travel of the film, forming a step of individual thickness, and (b) forming the individual thickness profile according to one or more a step of measuring a thickness profile, (c) a step of adjusting a lip gap of the mold according to the measured thickness profile, and a set thickness profile; (C) a process of winding the film into a roll shape, in the project (B) In order to satisfy the following conditions, the thickness of the film is adjusted, R 1 ≦ 2.0 μm, σ 1 ≦ 0.5 μm, R AV ≦ 1.0 μm, and σ AV ≦ 0.2 μm, where R 1 is The difference between the maximum value and the minimum value of the film thickness in the measured thickness profile at one time, indicating the measured thickness The amplitude of the surface film thickness, σ 1 of the system indicates a measure of the thickness profile of film thickness variations, R AV system 100 represents the consecutive measurement of the thickness profile produced by adding the cumulative average of the average cross-sectional view of the obtained The difference between the maximum value and the minimum value of the film thickness indicates the amplitude of the film thickness in the cumulative average cross section, and σ AV indicates the standard deviation of the film thickness in the cumulative average cross section].

[2]如上述[1]所記載之製造方法,其中,在上述步驟(a)中,根據以特定間隔測量從上述薄膜之寬方向之一方之端部至另一方之端部,或從另一方之端部至一方之端部而所取得之與薄膜厚度有關的測量資料,製作一個上述個別厚度剖面。 [2] The production method according to the above [1], wherein, in the step (a), the end portion from one end of the width direction of the film to the other end is measured at a specific interval, or from another The measurement data relating to the thickness of the film obtained from the end of one of the ends to the end of one of the ones is made to have one of the above individual thickness profiles.

[3]如上述[1]所記載之製造方法,其中,在上述步驟(b)中,根據兩個以上之上述個別厚度剖面,製作上述測量厚度剖面。 [3] The production method according to [1] above, wherein in the step (b), the measured thickness profile is produced based on two or more individual thickness profiles.

[4]如上述[1]~[3]中之任一項所記載之製造方法,其中,上述設定厚度剖面係從由期待厚度剖面及逆符號剖面所構成之群中被選擇出。 [4] The production method according to any one of [1] to [3] wherein the set thickness profile is selected from the group consisting of a desired thickness profile and an inverse symbol profile.

[5]如上述[4]所記載之製造方法,其中,上述設定厚度剖面為逆符號剖面。 [5] The production method according to [4] above, wherein the set thickness profile is an inverse symbol cross section.

[6]如上述[5]所記載之製造方法,其中,上述逆符號剖面係每製作上述測量厚度剖面,就根據該測量厚度剖面而被製作。 [6] The production method according to [5] above, wherein the inverse sign profile is produced based on the measured thickness profile for each of the measured thickness profiles.

若藉由本發明,可以不用利用振盪,有效果地製造外觀良好之薄膜卷材。 According to the present invention, it is possible to efficiently produce a film web having a good appearance without using oscillation.

1‧‧‧模具 1‧‧‧Mold

2‧‧‧調整手段 2‧‧‧Adjustment means

3‧‧‧鑄造輥 3‧‧‧ casting rolls

3’‧‧‧鑄造輥(或是對向輥) 3'‧‧‧ casting rolls (or counter rolls)

3”‧‧‧鑄造輥(或是冷卻輥) 3"‧‧‧ casting rolls (or cooling rolls)

4‧‧‧熱可塑性樹脂薄膜 4‧‧‧ thermoplastic resin film

5‧‧‧厚度測量器 5‧‧‧ thickness gauge

6‧‧‧薄膜卷材 6‧‧‧ film coil

7‧‧‧控制手段 7‧‧‧Control means

第1圖為表示在本發明之製造方法及本發明之製造方法中所使用之裝置之一例的概略圖。 Fig. 1 is a schematic view showing an example of a device used in the production method of the present invention and the production method of the present invention.

第2圖為用以說明逆符號剖面之概略圖。 Fig. 2 is a schematic view for explaining a cross section of an inverse symbol.

第3圖為表示藉由調整薄膜厚度使得薄膜厚度變化的概略圖。 Fig. 3 is a schematic view showing a change in film thickness by adjusting the thickness of the film.

以下,針對本發明之薄膜卷材之製造方法之一實施型態,一面參照圖面,一面予以詳細說明,本發明並不限定於該實施型態。 Hereinafter, one embodiment of the method for producing a film web of the present invention will be described in detail with reference to the drawings, and the present invention is not limited to the embodiment.

第1圖為表示在本發明之薄膜卷材之製造方法及本發明之製造方法中可以使用之裝置之一例的概略圖。 Fig. 1 is a schematic view showing an example of a device which can be used in the method for producing a film roll of the present invention and the method for producing the film of the present invention.

在本發明之薄膜卷材之製造方法中可以使用之裝置係如第1圖所示般,具備:可以將熔融之熱可塑性樹脂吐出成薄膜狀之模具1;可以調整熱可塑性樹脂之吐出量,進而可以調整由如此之熱可塑性樹脂所構成之薄膜之厚度的調整手段2;夾著熔融之熱可塑性樹脂,可以成形薄膜狀而對其表面賦與平滑性,並且進行冷卻的至少一根鑄造輥3(以及3’及3”);被配置在熱可塑性樹脂薄膜4之移行路上,可以測量與薄膜4之移行方向正交之薄膜之寬方向之厚度的厚度測量器5;可以將熱可塑性樹脂薄膜4捲成捲筒狀之捲取機(無圖示);可以儲存以厚度測量器5所測量之資料,並處理其測量資料而對調整手段2給予指示之控制手段7。 The apparatus usable in the method for producing a film roll of the present invention has a mold 1 capable of discharging molten thermoplastic resin into a film shape as shown in Fig. 1, and the discharge amount of the thermoplastic resin can be adjusted. Further, the adjusting means 2 for adjusting the thickness of the film made of such a thermoplastic resin can be adjusted; and at least one casting roll which can form a film shape and impart smoothness to the surface and which is cooled can be formed by sandwiching the molten thermoplastic resin. 3 (and 3' and 3"); disposed on the moving path of the thermoplastic resin film 4, the thickness measuring device 5 capable of measuring the thickness in the width direction of the film orthogonal to the traveling direction of the film 4; thermoplastic resin can be used The film 4 is wound into a roll-like reel (not shown); the control means 7 for instructing the adjustment means 2 can be stored by storing the data measured by the thickness measuring device 5 and processing the measurement data.

使用如上述般所構成之裝置,在本發明之製 造方法中,以捲取機(無圖示)將藉由熔融擠壓成形所成形之熱可塑性樹脂薄膜4捲成捲筒狀,最終形成薄膜卷材6。 Using the device constructed as described above, in the system of the present invention In the production method, the thermoplastic resin film 4 formed by melt extrusion molding is wound into a roll shape by a coiler (not shown) to finally form the film web 6.

並且,在本發明中,將熱可塑性樹脂薄膜4捲成捲筒狀者稱為「薄膜卷材」。 Further, in the present invention, the thermoplastic resin film 4 is wound into a roll and is referred to as a "film roll".

在本發明之製造方法中,如第1圖所示般,首先對擠壓機(無圖示)連續性供給熱可塑性樹脂,藉由模具1擠壓熔融之熱可塑性樹脂而成形薄膜狀。更詳細而言,從模具1之模唇之縫隙狀之間隙擠壓熱可塑性樹脂。 In the production method of the present invention, as shown in Fig. 1, first, a thermoplastic resin is continuously supplied to an extruder (not shown), and the molten thermoplastic resin is pressed by the mold 1 to form a film. More specifically, the thermoplastic resin is pressed from the slit-like gap of the die lip of the mold 1.

就以熱可塑性樹脂而言,可舉出乙烯、丙烯、丁烯、己烯等之烯系單體之均聚物或兩種類以上之上述烯系單體之共聚合體、一種類以上之上述烯系單體,和能與上述烯系單體聚合的一種類以上之聚合性單體之共聚合體等之聚烯系樹脂;聚甲基丙烯酸酯(PMA)、聚甲基丙烯酸甲酯(PMMA)、乙烯-丙烯酸乙酯共聚合體等之丙烯酸系樹脂;丁二烯-苯乙烯共聚合體、丙烯腈-苯乙烯共聚合體、聚苯乙烯、苯乙烯一丁二烯一苯乙烯共聚合體、苯乙烯/異戊二烯/苯乙烯共聚合體、苯乙烯-丙烯酸共聚合體等之苯乙烯系樹脂;氯乙烯系樹脂;聚氟乙烯、聚偏二氟乙烯等之氟化乙烯系樹脂;6-耐隆、6,6-耐隆、12-耐隆等之醯胺系樹脂;聚對苯二甲酸乙二醇酯、聚對苯二甲酸丁二等之酯系樹脂;聚碳酸酯系樹脂、聚苯醚系樹脂、聚縮醛系樹脂、聚苯硫系樹脂、聚矽氧系樹脂、熱可塑性胺甲酸乙酯系樹脂、聚醚醚酮系樹脂、聚醚醯亞胺系樹脂、 熱可塑性彈性體系樹脂、架橋樹脂等。並且,在本發明中可以所使用之熱可塑性樹脂並不限定於上述,若為可以藉由熔融擠壓成形而成形薄膜狀者即可,不特別限制。 The thermoplastic resin may, for example, be a homopolymer of an ethylenic monomer such as ethylene, propylene, butylene or hexene or a copolymer of two or more kinds of the above-mentioned ethylenic monomers, or more than one type of the above alkene. a polyolefin resin such as a monomer and a copolymer of one or more kinds of polymerizable monomers capable of polymerizing with the above olefinic monomer; polymethacrylate (PMA), polymethyl methacrylate (PMMA) Acrylic resin such as ethylene-ethyl acrylate copolymer; butadiene-styrene copolymer, acrylonitrile-styrene copolymer, polystyrene, styrene-butadiene-styrene copolymer, styrene/ a styrene resin such as an isoprene/styrene copolymer or a styrene-acrylic acid copolymer; a vinyl chloride resin; a fluorinated vinyl resin such as polyvinyl fluoride or polyvinylidene fluoride; and 6-endron, 6,6-Anthracycline resin such as Nylon, 12-Nylon, etc.; ester resin of polyethylene terephthalate or polybutylene terephthalate; polycarbonate resin, polyphenylene ether Resin, polyacetal resin, polyphenylene sulfide resin, polyfluorene resin, heat Plastic amine urethane resins, polyether ether ketone-based resins, polyetherimide resins, Thermoplastic elastomeric resin, bridging resin, etc. In addition, the thermoplastic resin which can be used in the present invention is not limited to the above, and is not particularly limited as long as it can be formed into a film by melt extrusion molding.

熱可塑性樹脂即使以任意之量含有適當橡膠粒子、脂肪酸酯、安定化劑、氧化防止劑、紫外線吸收劑、阻燃劑、非離子系界面活性劑等之添加劑亦可。 The thermoplastic resin may contain an additive such as a suitable rubber particle, a fatty acid ester, a stabilizer, an oxidation inhibitor, an ultraviolet absorber, a flame retardant, or a nonionic surfactant in an optional amount.

模具1具備模唇,該模唇具有吐出熔融之樹脂的縫隙狀之間隙,在該模唇,於其模唇寬上,每特定區間各設置有調整手段2。 The mold 1 is provided with a lip having a slit-like gap for discharging molten resin, and the mold lip is provided with an adjustment means 2 for each specific section in the lip width of the lip.

調整手段2若為可以調整吐出熔融之樹脂的模唇之間隙者即可,進一步為可以在指定之每區間獨立調整從模唇吐出之熔融樹脂之吐出量者,可以在各區間獨立調整模具1之全寬方向中之熔融樹脂之吐出量分布者。其結果,本發明中,可以調整熱可塑性樹脂薄膜4(之後,也有樹脂薄膜4或薄膜4或僅略稱為薄膜之情形)之寬方向之厚度分布。 In the adjustment means 2, it is sufficient to adjust the gap between the lips of the molten resin, and it is also possible to independently adjust the discharge amount of the molten resin discharged from the lip in each of the designated sections, and the mold 1 can be independently adjusted in each section. The discharge amount distribution of the molten resin in the full width direction. As a result, in the present invention, the thickness distribution in the width direction of the thermoplastic resin film 4 (hereinafter, also in the case of the resin film 4 or the film 4 or simply a film) can be adjusted.

調整手段2若為具有可以在模具1之模唇寬方向之特定的每區間調整模唇之間隙的機構,進一步若為具有可以在各區間獨立調整熔融樹脂之吐出量的機構即可,並不特別限制,例如可沿著模唇寬而藉由每區間所具備之螺栓的推壓可在其區間調整模唇之間隙的手段;由螺栓,和被配置在如此之螺栓之周圍的電氣而可自由調整傳熱量之加熱器所構成,而且利用其熱量所導致的螺栓伸縮而可在每區間獨立調整模唇之間隙的熱螺栓方式之致動器 等,在本發明中,其中又以使用熱螺栓方式之致動器為佳。 The adjustment means 2 is a mechanism that has a gap that can adjust the gap of the lip in a specific direction of the lip width direction of the mold 1, and further has a mechanism that can independently adjust the discharge amount of the molten resin in each section, and does not In particular, for example, a means for adjusting the gap of the lip in the interval by pushing the bolt provided in each section along the width of the lip; by means of a bolt, and being electrically disposed around such a bolt A thermo-bolt type actuator that is constructed by a heater that freely adjusts the amount of heat transfer and that can independently adjust the gap between the lips in each section by utilizing the expansion and contraction of the bolt caused by the heat. Etc. In the present invention, an actuator using a hot bolt method is preferred.

再者,調整手段2係在模具1之模唇之全寬,各自獨立設置在模唇之寬方向之特定的每區間,該區間之間隔一般為10~100mm,最佳為20~60mm。因此,例如被設置在模唇寬為1800mm之模具1的厚度調整手段2之數量一般為18~180個,最佳為30~90個。 Further, the adjustment means 2 is formed on the entire width of the lip of the mold 1, and is independently provided in each of the specific sections in the width direction of the lip, and the interval of the section is generally 10 to 100 mm, preferably 20 to 60 mm. Therefore, for example, the number of the thickness adjusting means 2 of the mold 1 which is set to have a lip width of 1800 mm is generally 18 to 180, preferably 30 to 90.

如此一來,從模具1之模唇被擠壓之熔融樹脂,即使已係薄膜狀之形態亦可,然後接著例如第1圖所示般,被夾在兩根之鑄造輥3及3’而成形及冷卻,並且因應所需,可利用第3根鑄造輥3”來冷卻固化(並且,鑄造輥3’也有被稱為對向輥之情形,鑄造輥3”也有被稱冷卻輥之情形)。 As a result, the molten resin extruded from the lip of the mold 1 can be sandwiched between the two casting rolls 3 and 3', as shown in Fig. 1, for example, even if it is in the form of a film. Forming and cooling, and if necessary, the third casting roll 3" can be used to cool and solidify (and the casting roll 3' is also referred to as a counter roll, and the casting roll 3" is also referred to as a cooling roll) .

並且,在本實施型態中,係以可以使用3根輥而成形薄膜及冷卻固化之3根輥法為例,但是鑄造輥即使為一根亦可,即使為兩根或4根以上之複數根亦可。再者,鑄造輥在第1圖中,雖然係在排列成橫一列的狀態下配置,但是其配置並不特別限制,例如即使為在排列成縱一列之I字形或L字形、逆L字形、Z字形、逆Z字形或傾斜配置等之狀態下配置亦可。 Further, in the present embodiment, a three-roll method in which a film can be formed by using three rolls and cooled and solidified is exemplified, but even if one of the casting rolls is one, even two or four or more plural numbers may be used. Roots can also. Further, in the first drawing, the casting rolls are arranged in a state of being arranged in a row, but the arrangement thereof is not particularly limited, and for example, even in an I-shape or an L-shape and an inverse L-shape arranged in a vertical column, It may be arranged in a state of a zigzag, an inverse zigzag, or a tilted configuration.

鑄造輥之表面即使因應薄膜之表面所要求之性能,例如施予電鍍處理亦可,然後即使為又藉由研磨精加工賦予鏡面性的鏡面輥亦可。再者,即使施予可賦予編織形狀、稜鏡形狀或柱形狀之透鏡形狀的加工或處理亦 可。 The surface of the casting roll can be applied to the surface of the film, for example, by applying a plating treatment, and then even a mirror roll which is mirror-finished by polishing finishing. Furthermore, even if a processing or treatment that imparts a lens shape that imparts a braided shape, a serpentine shape, or a columnar shape is applied can.

就以鑄造輥之構造而言,即使為具有削取圓筒形之金屬而製作出之剛性高的鑽孔構造的輥(或是削取輥)亦可,即使為具有在周圍配置由薄金屬所構成之無接縫之筒的彈性構造之輥(所謂的彈性輥)亦可。並且,鑄造輥即使其表面以聚矽氧或氟系之橡膠素材所構成亦可。一般而言,在輥之內部循環冷卻用之熱媒體,其溫度可因應熱可塑性樹脂之熱特性而適當變更。 In terms of the structure of the casting roll, even a roller (or a cutting roll) having a highly rigid drilling structure which is formed by cutting a cylindrical metal can be disposed even with a thin metal disposed around it. The elastic structure of the seamless tube (so-called elastic roller) may be formed. Further, the casting roll may be formed of a rubber material such as polyfluorene or fluorine. In general, the temperature of the heat medium for circulating cooling inside the roll can be appropriately changed in accordance with the thermal characteristics of the thermoplastic resin.

如此一來,熔融樹脂藉由與輥表面接觸並且在輥上通過,適當成形及冷卻固化,而成為樹脂薄膜4,因應所需通過任意之複數根之搬運用輥及/或旋轉輥,最終藉由捲取機,被捲成捲筒狀,而成為薄膜卷材6。 In this way, the molten resin is brought into contact with the surface of the roll and passed over the roll, suitably formed and cooled and solidified, thereby becoming the resin film 4, and finally passes through any of a plurality of carrying rolls and/or rotating rolls as needed, and finally borrows It is wound into a roll shape by a coiler to form a film web 6.

樹脂薄膜4即使在被捲成捲筒狀而成為薄膜卷材6之期間,通過被配置在薄膜之上下的一對厚度測量器5,因應所需,通過異物檢查機(無圖示)、保護薄膜貼合機(無圖示)、端部分條機(無圖示)等亦可。該些之機器係因應樹脂薄膜所要求之性能而事先適當選擇,一般而言,以具備厚度測量器5和異物檢查機及端部分條機為多。 The resin film 4 is passed through a pair of thickness measuring devices 5 disposed above and below the film, and is subjected to a foreign matter inspection machine (not shown) and protected, even when being wound into a roll shape to form the film roll 6. A film laminating machine (not shown), an end parting machine (not shown), or the like may be used. These machines are appropriately selected in advance in accordance with the performance required for the resin film, and generally have a thickness measuring device 5, a foreign matter inspection machine, and an end portion machine.

就以厚度測量器5,例如使兩個測量探針配置成各接觸於薄膜之兩側(上下),藉由測量其測量探針間之距離,測量薄膜之厚度的接觸式之測量器;可以使用放射線等,以非接觸方式測量薄膜之厚度的非接觸式之測量器等,其中在本發明中,從防止對薄膜造成損傷等之觀點 來看,以使用非接觸式之測量器為佳。並且,即使在非接觸式之測量器之中,從可以在線上監視測量精度等之觀點來看,以使用放射線透過型之厚度測量器等為佳。 Taking the thickness measuring device 5, for example, the two measuring probes are arranged to contact the two sides (up and down) of the film, and the contact type measuring device for measuring the thickness of the film by measuring the distance between the measuring probes; A non-contact type measuring device or the like for measuring the thickness of a film in a non-contact manner using radiation or the like, wherein in the present invention, from the viewpoint of preventing damage to the film, etc. It is better to use a non-contact measuring device. Further, even in the non-contact type measuring instrument, it is preferable to use a radiation transmission type thickness measuring device or the like from the viewpoint of monitoring the measurement accuracy on the line or the like.

薄膜厚度之測量係於薄膜4在製造線上移行之期間,藉由厚度測量器5,在薄膜之寬方向進行從薄膜4之一方之端部朝另一方之端部的一次掃描(掃描)而測量薄膜厚度,接著連續進行從該薄膜4之另一方之端部朝一方之端部的又一次掃描(掃描)而測量薄膜厚度的操作,將在薄膜之寬方向以特定測量間隔所測量之薄膜厚度的測量值全部發送至控制手段7。 The measurement of the thickness of the film is performed by the thickness measuring device 5 during the scanning of the film 4 from the end of one side of the film 4 toward the other end by the thickness measuring device 5 (scanning). Film thickness, followed by continuous scanning (scanning) from the other end of the film 4 toward the other end to measure the film thickness, and the film thickness measured at a specific measurement interval in the width direction of the film The measured values are all sent to the control means 7.

如上述般,厚度測量器5因對在線上移行之樹脂薄膜4,一面在薄膜之寬方向掃描,一面測量其厚度,故以厚度測量器5實際測量之薄膜厚度之位置,相對於薄膜之移行方向及薄膜之寬方向為傾斜方向,該方向係可以由在樹脂薄膜4之線上移行之速度(以下,稱為線速度),和在厚度測量器5之薄膜寬方向掃描(scan)薄膜厚度而測量其厚度的掃描速度算出而決定。 As described above, the thickness measuring device 5 measures the thickness of the resin film 4 which is moved on the line while scanning in the width direction of the film, so that the position of the film thickness actually measured by the thickness measuring device 5 is shifted with respect to the film. The direction and the width direction of the film are oblique directions which can be shifted from the speed on the line of the resin film 4 (hereinafter, referred to as line speed), and the film thickness in the film width direction of the thickness measuring device 5 is scanned. The scanning speed at which the thickness is measured is calculated and determined.

在薄膜之寬方向中的厚度測量間隔,係能各對應於在模具1之模唇中為了配置調整手段2而所設置之區間的特定間隔,一般為0.1~30mm,例如於薄膜之全寬為1450mm之時,一區間之間隔若設為例如10mm即可。再者,在本發明中,在各區間,即使又設置複數之測量點而以特定之測量間隔更詳細地測量薄膜之厚度亦可。此時之測量間隔若在上述0.1~30mm之範圍內即可,並不特 別限制。 The thickness measurement interval in the width direction of the film can correspond to a specific interval in the section of the mold lip 1 for arranging the adjustment means 2, and is generally 0.1 to 30 mm, for example, the full width of the film is At 1450 mm, the interval between the intervals is set to, for example, 10 mm. Further, in the present invention, the thickness of the film may be measured in more detail at a specific measurement interval even if a plurality of measurement points are provided in each section. If the measurement interval at this time is within the range of 0.1 to 30 mm, it is not special. Do not limit.

線速度一般為10~100m/分鐘。測量器5在薄膜之寬方向一面測量薄膜厚度一面掃描(scan)之速度,一般為0.5~3m/分鐘。 The line speed is generally 10~100m/min. The measuring device 5 measures the thickness of the film on one side in the width direction of the film, and generally scans at a speed of 0.5 to 3 m/min.

然後,在本發明中,在上述工程(B)中,藉由重複以下詳細說明之步驟(a)、(b)及(c),根據樹脂薄膜4之移行中以測量器5測量所取得之與薄膜厚度有關之測量資料,從控制手段7各自對各調整手段2給予指示,可以在每區間獨立調整模唇之間隙,而調整樹脂薄膜4之厚度。 Then, in the present invention, in the above-mentioned work (B), the measurement is performed by the measuring device 5 in the course of the migration of the resin film 4 by repeating the steps (a), (b) and (c) which will be described in detail below. The measurement data relating to the thickness of the film is given to each of the adjustment means 2 from the control means 7, and the thickness of the resin film 4 can be adjusted by independently adjusting the gap of the lip in each section.

步驟(a):在與樹脂薄膜4之移行方向正交之樹脂薄膜4之寬方向,以特定間隔測量該移行中之樹脂薄膜4的厚度,作製個別厚度剖面之步驟,步驟(b):根據一個或其以上之上述個別厚度剖面,製作測量厚度剖面之步驟,及步驟(c):根據上述測量厚度剖面,和任意選擇之設定厚度剖面,調整模具1之唇部間隙之步驟;在步驟(a)中,例如在薄膜4之移行中,在與薄膜4之行走方向正交之薄膜之寬方向,藉由在薄膜之寬方向以每特定間隔進行一次分(即是,將從端部至端部為止設為一次分)從薄膜之一方之端部至另一方之端部,或從另一方之端部至一方之端部的薄膜之厚度掃描(scan),將在各測量點測量而取得之與薄膜厚度有關之測量資料(包含在各測量點之與薄膜厚度測量值有關之資 訊的資料,包含各測量點之位置資訊及在其測量點之薄膜厚度測量值等之資訊的資料)全部發送至控制手段7,每當如此的一次分之測量資料被發送至控制手段7,在控制手段7,被發送之測量資料中,根據當作製品被使用之製品有效寬內的某測量點之測量資料,製作「個別厚度剖面」。 Step (a): measuring the thickness of the resin film 4 in the transition at a specific interval in the width direction of the resin film 4 orthogonal to the traveling direction of the resin film 4, and forming a step of individual thickness, step (b): One or more of the above individual thickness profiles, a step of measuring the thickness profile, and a step (c): the step of adjusting the lip gap of the mold 1 according to the measured thickness profile and the arbitrarily selected thickness profile; In a), for example, in the migration of the film 4, in the width direction of the film orthogonal to the traveling direction of the film 4, by one minute at a specific interval in the width direction of the film (that is, from the end to the end) The thickness of the film from one end of the film to the other end or from the other end to the end of one of the films is measured at each measurement point. Measurement data relating to film thickness (including the measurement of film thickness at each measurement point) The information of the information, including the information of the position of each measuring point and the information of the film thickness measurement at the measuring point, is sent to the control means 7, and each such measurement data is sent to the control means 7, In the control means 7, the "individual thickness profile" is created based on the measurement data of a certain measurement point within the effective width of the product to be used as the product.

因此,本發明中之「個別厚度剖面」係包含以特定間隔設置在薄膜之寬方向上之各測量點的與薄膜厚度測量值有關之資訊的資料,意味著包含藉由薄膜寬方向之一次分之掃描測量所取得之製品有效寬內之各測量點之位置資訊及在其測量點的薄膜厚度測量值等之資訊的資料。 Therefore, the "individual thickness profile" in the present invention includes information on the measurement of the film thickness at each measurement point of the film in the width direction of the film at a specific interval, which means that the film is divided by the width direction of the film. Scanning and measuring information on the positional information of each measurement point within the effective width of the product obtained and the measurement of the film thickness at the measurement point.

並且,在上述實施型態中,雖然敘述根據當作製品使用之薄膜之製品有效寬內之測量資料,製作個別厚度剖面,但是在本發明中,個別厚度剖面並不僅限定於如此所製作之個別厚度剖面,即使根據從薄膜之寬方向之一方之端部至另一方端部,或從另一方之端部至一方之端部的掃描(scan)而取得的所有測量資料,製作一個個別厚度剖面亦可。 Further, in the above embodiment, although the individual thickness profile is produced based on the measurement data of the effective width of the product used as the film for the product, in the present invention, the individual thickness profile is not limited to the individual thus produced. In the thickness profile, an individual thickness profile is formed even for all measurement data obtained from one end of the film in the width direction to the other end or from the other end to the end of one of the scans. Also.

因此,在本發明中,其特徵為根據每次以特定間隔從薄膜寬方向之一方之端部至另一方之端部,或從另一方之端部至一方之端部,測量薄膜之厚度,即是薄膜之寬方向之掃描測量一次分之與薄膜厚度有關之所有測量資料,在薄膜之全寬或製品有效寬製作一個個別厚度剖面。 Therefore, in the present invention, it is characterized in that the thickness of the film is measured in accordance with the end portion from one end of the film width direction to the other end portion at a specific interval, or from the end portion of the other side to one end portion. That is, the scanning of the width direction of the film is measured once and all the measurement data relating to the film thickness, and an individual thickness profile is made at the full width of the film or the effective width of the product.

並且,在本發明中,薄膜之製品有效寬係於 薄膜卷材製造時,可事先任意設定者,相對於薄膜之全寬,一般為50~95%,最佳為60~90%,更佳為65~85%。在上述範圍內之薄膜,寬方向之薄膜厚度幾乎無偏差大之部分。並且,在本發明中,樹脂薄膜4之厚度的「偏差」係指對於樹脂薄膜4之期待厚度,樹脂薄膜4之厚度變大或變小之意,意味著薄膜之厚度不均勻。 Moreover, in the present invention, the film product is effectively widened to When the film roll is manufactured, it can be arbitrarily set in advance, and is generally 50 to 95%, preferably 60 to 90%, and more preferably 65 to 85%, with respect to the full width of the film. In the film within the above range, the film thickness in the width direction has almost no deviation. Further, in the present invention, the "deviation" of the thickness of the resin film 4 means that the thickness of the resin film 4 becomes larger or smaller with respect to the desired thickness of the resin film 4, meaning that the thickness of the film is not uniform.

再者,如此一來,在樹脂薄膜4被捲成薄膜卷材之前,被捲取之樹脂薄膜4之寬度原樣地成為製品寬,藉由利用分條機等修整薄膜之寬方向之端部(即使為雙方之端部亦可,單方之端部亦可),有效率地切掉樹脂薄膜4之製品有效寬外之厚度的偏差大之部分(例如,邊珠等),可以在製品有效寬內,取得於薄膜4之寬方向之厚度幾乎無偏差之外觀之良好的薄膜卷材。 In addition, before the resin film 4 is wound into a film roll, the width of the wound resin film 4 is as wide as the product, and the end portion in the width direction of the film is trimmed by a slitter or the like ( Even if it is the end of both sides, the end of the unilateral portion can be cut efficiently, and the portion of the resin film 4 that is effectively widened outside the thickness of the product (for example, beaded beads, etc.) can be efficiently cut. In the meantime, a film roll having a good appearance in which the thickness of the film 4 in the width direction is almost the same is obtained.

再者,在本發明中,製品有效寬一般係在樹脂薄膜4之寬方向中,除去樹脂薄膜4之兩端部的中央部的寬度。例如,薄膜之全寬為1450mm之時,當從薄膜之寬方向之兩端部朝中央部側各修整100mm時,該薄膜之製品有效寬成為1250mm。 Further, in the present invention, the effective width of the product is generally in the width direction of the resin film 4, and the width of the central portion of both end portions of the resin film 4 is removed. For example, when the full width of the film is 1450 mm, when the film is trimmed 100 mm from both end portions in the width direction of the film toward the center portion side, the effective width of the film product is 1,250 mm.

接著,在步驟(b)中,根據在上述步驟(a)製作之一個或其以上之「個別厚度剖面」,製作「測量厚度剖面」。 Next, in the step (b), a "measured thickness profile" is created based on one or more "individual thickness profiles" produced in the above step (a).

在本發明中,「測量厚度剖面」係為了將上述個別厚度剖面所含的與薄膜厚度有關之測量資料分割成以與此相同之間隔設置在對應於各調整手段1區間(即是,為了配 置調整手段2,以特定間隔在模具1之模唇寬方向設置在模唇的每個區間)之薄膜之寬方向的每區間(以下,也有略稱為「測量區間」之情形)而整理出的薄膜之寬方向之製品有效寬或全寬中之與薄膜之厚度有關的資訊資料。 In the present invention, the "measuring thickness profile" is for dividing the measurement data relating to the thickness of the film contained in the individual thickness profile into the interval corresponding to the adjustment means 1 at the same interval (that is, for matching The adjustment means 2 is arranged at a specific interval in each section of the width direction of the film (in each section of the lip of the mold 1 in the lip width direction) (hereinafter, abbreviated as "measurement section") Information about the effective width or full width of the film in the width direction of the film.

再者,「測量厚度剖面」係如同上述般,根據一個或其以上之「個別厚度剖面」而製作出,在本發明中,「根據一個或其以上之個別厚度剖面,製作測量厚度剖面」係指在初期設定成於製作測量厚度剖面之時使用一個個別厚度剖面之情況下,原樣地使用其個別厚度剖面,製作測量厚度剖面之意,於初期設定成製作測量厚度剖面之時使用兩個以上之個別厚度剖面之情況下,使用將該兩個以上之個別厚度剖面在所對應之每區間與薄膜厚度有關之測量資料相加平均而所取得之剖面,而製作出測量厚度剖面之意。 Further, the "measured thickness profile" is produced based on one or more "individual thickness profiles" as described above, and in the present invention, "measurement thickness profile is made based on one or more individual thickness profiles" In the case where an individual thickness profile is used in the initial setting to produce a measured thickness profile, the individual thickness profile is used as it is, and the measurement of the thickness profile is made. When the measurement thickness profile is initially set, two or more are used. In the case of the individual thickness profile, the profile obtained by adding and averaging the two or more individual thickness profiles to the measurement data relating to the film thickness in each interval is used to produce a measurement thickness profile.

因此,在本發明中,「根據兩個以上之個別厚度剖面而所製作出之測量厚度剖面」係指在薄膜之移行方向中所對應之每區間,將兩個以上之上述定義的個別厚度剖面,其區間內之與薄膜厚度有關之測量資料,在薄膜之移行方向相加平均而所取得之剖面之意。 Therefore, in the present invention, the "measured thickness profile formed based on two or more individual thickness profiles" means two or more individual thickness profiles defined above in each interval corresponding to the direction of travel of the film. The measurement data relating to the thickness of the film in the interval, the mean of the profile obtained by adding the average in the direction of migration of the film.

此時,各區間內之與薄膜厚度有關之測量資料,即使在薄膜之行走方向之對應的每測量點與其薄膜厚度測量值相加平均,或在各區間內,於在薄膜之寬方向具有複數測量點之情況下,將在各區間所取得之該些薄膜厚度測量值之平均值當作其區間之薄膜厚度的測量值,各在薄膜之移 行方向相加平均而製作測量厚度剖面亦可。 At this time, the measurement data relating to the film thickness in each section is evenly averaged at each measurement point corresponding to the traveling direction of the film and its film thickness measurement value, or in each interval, and has a plurality in the width direction of the film. In the case of measuring points, the average value of the film thickness measurements obtained in each section is taken as the measurement of the film thickness of the interval, and each is moved in the film. It is also possible to create a measured thickness profile by adding the average of the row directions.

再者,在本發明中,於製作測量厚度剖面之時所使用之兩個以上之個別厚度剖面,即使為連續,或不連續者亦可。 Furthermore, in the present invention, two or more individual thickness profiles used in the measurement of the thickness profile may be continuous or discontinuous.

在本發明之一的較佳實施型態中,即使在測量厚度剖面之製作中,將與薄膜之厚度有關之測量資料分割成調整手段每1區間(或是每測量區間)而加以整理之時,在一個個別厚度剖面,於薄膜寬方向之各區間內具有複數之測量點,且在各區間各取得複數之薄膜厚度之情況下,在其區間,將薄膜厚度測量值相加平均而所取得之平均值當作其區間之薄膜厚度測量值,在各個對應之每區間於薄膜之移行方向又將其薄膜厚度之測量值(平均值)予以相加平均,製作測量厚度剖面亦可。 In a preferred embodiment of the present invention, even in the production of the measured thickness profile, the measurement data relating to the thickness of the film is divided into adjustment means for each interval (or per measurement interval). In a single thickness profile, there are a plurality of measurement points in each section of the film width direction, and in the case where a plurality of film thicknesses are obtained in each section, the film thickness measurement values are added and averaged in the interval. The average value is taken as the film thickness measurement value in the interval, and the measured value (average value) of the film thickness is added and averaged in each of the corresponding intervals in the film moving direction, and the measured thickness profile may be produced.

更具體而言,在一個個別厚度剖面中,對應於調整手段1區間之薄膜厚度測量區間內所取得之與薄膜厚度有關之測量資料,包含在薄膜之寬方向以5點所測量之薄膜厚度測量值之情況,將在其5點之薄膜厚度測量值之平均值當作其區間之薄膜厚度測量值,在各個所對應之每區間,於薄膜之移行方向將其值予以相加平均而製作「測量厚度剖面」。 More specifically, in an individual thickness profile, the measurement data relating to the film thickness obtained in the film thickness measurement section corresponding to the section of the adjustment means 1 includes the film thickness measurement measured at 5 points in the width direction of the film. In the case of the value, the average value of the film thickness measurement at 5 o'clock is taken as the film thickness measurement value of the interval, and the values are added and averaged in the moving direction of the film in each corresponding interval to create " Measuring the thickness profile".

因此,在本發明中,如此一來,可以在一個個別厚度剖面中,在每區間(即是,每調整手段,或調整手段每1區間,或對應於其調整手段1區間的薄膜之每測量區間),算出薄膜厚度之平均值,而如上述般製作測量厚度 剖面。 Therefore, in the present invention, each measurement of the film in each section (i.e., every adjustment means, or adjustment means per section, or section corresponding to the adjustment means 1 thereof) can be performed in an individual thickness profile. Interval), the average value of the film thickness is calculated, and the measured thickness is prepared as described above. section.

並且,在本發明中,即使不如上述般在一個個別厚度剖面中,於每區間算出薄膜厚度測量值之平均值,製作出上述測量厚度剖面亦可。此時,藉由原樣地使用在各測量點所取得之薄膜厚度測量值,即是將在各測量點所取得之薄膜厚度測量值,原樣地各在薄膜之縱向予以相加平均,可以製作測量厚度剖面。 Further, in the present invention, even if the average value of the film thickness measurement values is calculated in each section in an individual thickness profile as described above, the measured thickness profile may be produced. At this time, by using the film thickness measurement values obtained at the respective measurement points as they are, that is, the film thickness measurement values obtained at the respective measurement points are added to the longitudinal direction of the film as they are, and the measurement can be made. Thickness profile.

再者,在本發明中,即使於製作測量厚度剖面之時,在各測量點之剖面厚度測量值重複使用亦可。 Further, in the present invention, even when the measurement thickness profile is produced, the profile thickness measurement value at each measurement point may be repeatedly used.

步驟(c):根據上述步驟(b)所製作出的「測量厚度剖面」,和任意選擇之「設定厚度剖面」,調整模具1之唇部間隙。 Step (c): Adjusting the lip gap of the mold 1 based on the "measured thickness profile" produced in the above step (b) and the arbitrarily selected "set thickness profile".

詳細而言,比較在步驟(b)所製作出之「測量厚度剖面」,和以下詳細說明之「設定厚度剖面」,更具體而言,在調整手段每1區間(或是所對應之薄膜厚度之每測量區間),將「測量厚度剖面」與「設定厚度剖面」比較,以之後所製作出之「測量厚度剖面」與「設定厚度剖面」一致或接近,更具體而言在各個調整手段1區間(或是所對應之測量區間),「測量厚度剖面」與「設定厚度剖面」一致或接近之方式,從控制手段7對各調整手段2各給予指示。 Specifically, the "measured thickness profile" produced in the step (b) is compared with the "set thickness profile" described in detail below, and more specifically, in each section of the adjustment means (or the corresponding film thickness) For each measurement interval, the "measured thickness profile" is compared with the "set thickness profile", and the "measured thickness profile" created later is the same as or close to the "set thickness profile", more specifically in each adjustment means 1 In the section (or the corresponding measurement section), the "measurement thickness profile" is equal to or close to the "set thickness profile", and each control means 2 is instructed by the control means 7.

作為「設定厚度剖面」,可舉出例如薄膜之厚度被設定成一定之「期待厚度剖面」,及以下更詳細說明之「逆符號剖面」等,在本發明中,可以事先任意選擇 該些而予以使用。 For example, the "predetermined thickness profile" in which the thickness of the film is set to be constant, and the "inverse symbol profile" described in more detail below, etc., can be arbitrarily selected in the present invention. These are used.

首先,「期待厚度剖面」若因應薄膜製品之期待的厚度而適當調整及決定即可,可設定成例如10~300μm、30~150μm之範圍內之厚度,以一定的厚度為理想。 First, the "expected thickness profile" may be appropriately adjusted and determined in accordance with the expected thickness of the film product, and may be set to a thickness in the range of, for example, 10 to 300 μm and 30 to 150 μm, and is preferably a constant thickness.

例如,在某區間,於「測量厚度剖面」之厚度大於「期待厚度剖面」之厚度之情況下,從控制手段7對所對應之調整手段2給予指示使縮窄模唇間隙(即是,關閉模唇),再者,於「測量厚度剖面」之厚度小於「期待厚度剖面」之厚度之情況下,從控制手段7對所對應之調整手段2給予指示使增大模唇間隙(即是,打開模唇)。 For example, in a certain section, when the thickness of the "measured thickness profile" is larger than the thickness of the "expected thickness profile", the control means 7 gives an instruction to the corresponding adjustment means 2 to narrow the lip gap (ie, close) Further, in the case where the thickness of the "measured thickness profile" is smaller than the thickness of the "expected thickness profile", the control means 7 gives an instruction to the corresponding adjustment means 2 to increase the lip gap (ie, Open the lip).

如此一來,在本發明中,於薄膜4之移行中,重複步驟(a)、(b)及(c),可以在每區間獨立調整薄膜厚度。 As a result, in the present invention, steps (a), (b), and (c) are repeated in the migration of the film 4, and the film thickness can be independently adjusted in each section.

並且,在本發明之工程(B)中,以滿足以下之條件之方式,又調整薄膜4之厚度。 Further, in the engineering (B) of the present invention, the thickness of the film 4 is adjusted in such a manner as to satisfy the following conditions.

R1≦2.0μm,σ1≦0.5μm,RAV≦1.0μm,及σAV≦0.2μm,式中,R1係一次之上述測量厚度剖面中之薄膜厚度之最大值和最小值之差,表示上述測量厚度剖面中之薄膜厚度之振幅(以下,也有略稱為「振幅R1」之情形),σ1係表示一次的上述測量厚度剖面中之薄膜厚度之標 準偏差(以下,也有略稱為「標準偏差σ1之情形」),RAV係表示100次連續製作上述測量厚度剖面而相加平均所取得之累計平均剖面中之薄膜厚度之最大值和最小值之差,表示上述累計平均剖面中之薄膜厚度的振幅(以下,也有略稱「振幅RAV之情形」),σAV係表示上述累計平均剖面中之薄膜厚度之標準偏差(以下,也有略稱為「標準偏差σAV之情形」)。 R 1 ≦ 2.0 μm, σ 1 ≦ 0.5 μm, R AV ≦ 1.0 μm, and σ AV ≦ 0.2 μm, where R 1 is the difference between the maximum and minimum thicknesses of the film thickness in the above measured thickness profile, The amplitude of the film thickness in the above-described measured thickness profile (hereinafter, also referred to as "amplitude R 1 "), and σ 1 represents the standard deviation of the film thickness in the above-mentioned measured thickness profile (hereinafter, also referred to as abbreviated In the case of "standard deviation σ 1 ", R AV is the difference between the maximum value and the minimum value of the film thickness in the cumulative average profile obtained by continuously adding the above-mentioned measured thickness profiles for 100 consecutive times, indicating the cumulative average The amplitude of the film thickness in the cross section (hereinafter, also referred to as "the case of the amplitude R AV "), and σ AV indicates the standard deviation of the film thickness in the cumulative average cross section (hereinafter, also referred to as "standard deviation σ AV "situation").

並且,在本發明中,於持續進行薄膜之製膜之期間,即是薄膜之移行中,將連續製作的100個「測量厚度剖面」予以相加平均,即是在薄膜之移行方向中,分別在每調整手段1區間,累計100次連續製作之各個「測量厚度剖面」所含之與薄膜厚度有關之測量資料,詳細而言,在各區間,在對應於薄膜之移形方向的每測量點,累計薄膜厚度測量值,或將期區間內之複數的薄膜厚度測量值當作其區間之薄膜厚度測量值,在各個對應的每區間於薄膜之移行方向累計該些值,藉由除以測量次數之100,製作出「累計平均剖面」。 Further, in the present invention, during the film formation of the film, that is, during the migration of the film, the 100 "measured thickness profiles" continuously produced are added and averaged, that is, in the traveling direction of the film, respectively. In each section of the adjustment means 1, the measurement data relating to the thickness of the film contained in each of the "measurement thickness profiles" which are continuously produced in 100 consecutive times, in detail, in each section, at each measurement point corresponding to the direction of migration of the film The cumulative film thickness measurement value, or the film thickness measurement value in the interval period is taken as the film thickness measurement value of the interval, and the values are accumulated in the moving direction of the film in each corresponding interval, by dividing by the measurement The number of times is 100, and the "cumulative average profile" is created.

因此,在本發明中,「累計平均剖面」係指包含藉由分別在設置於薄膜之寬方向之各調整手段1區間(或是所對應之各測量區間),在薄膜之移行方向將任意之100個的連續「測量厚度剖面」所含之與薄膜厚度有關之測量資料予以相加平均而算出之薄膜移行方向之各區間的薄膜厚度之平均有關之資訊的資料。 Therefore, in the present invention, the "cumulative average cross-section" means that it is included in each of the adjustment means 1 (or the corresponding measurement sections) provided in the width direction of the film, and is arbitrarily moved in the film direction. Information on the average of the film thicknesses in each section of the film transition direction calculated by adding and averaging the measurement data relating to the film thickness contained in 100 consecutive "measured thickness profiles".

再者,「累計平均剖面」之算出所使用之100個連續 的「測量厚度剖面」所含之與薄膜厚度有關之測量資料,即使各為如同上述般,在每調整手段1區間(或是所對應之測量區間)將複數之薄膜厚度測量值予以平均的平均值亦可。 Furthermore, the calculation of the "cumulative average profile" is 100 consecutive The measurement data relating to the thickness of the film contained in the "measured thickness profile", even if it is as described above, the average of the film thickness measurements is averaged in each adjustment means 1 interval (or the corresponding measurement interval). The value is also OK.

並且,「累計平均剖面」係分別在薄膜之寬方向的每調整手段1區間(或是所對應之測量區間)被整理,意味著涵蓋薄膜之全寬或製品有效寬之資料。 Further, the "cumulative average profile" is arranged in each section of the adjustment means 1 (or the corresponding measurement section) in the width direction of the film, which means that the full width of the film or the effective width of the product is covered.

然後,在本發明中,以下詳細說明之振幅R1及RAV以及標準偏差σ1及σAV各在控制手段7被被算出。 Then, in the present invention, the amplitudes R 1 and R AV and the standard deviations σ 1 and σ AV described in detail below are each calculated by the control means 7.

在本發明中,控制手段7並不特別限制,例如使用具有運算處理功能之控制機器,具體而言適當使用包含PC等者即可。 In the present invention, the control means 7 is not particularly limited, and for example, a control device having an arithmetic processing function is used. Specifically, a PC or the like may be used as appropriate.

在本發明中,在上述工程(B)中,又以從控制手段7對各調整手段2給予指示,使各個振幅R1及RAV以及標準偏差σ1及σAV滿足上述條件:R1≦2.0(μm)、RAV≦1.0(μm)、σ1≦0.5(μm)及σAV≦0.2(μm),在每區間獨立調整薄膜之厚度為重要。 In the present invention, in the above-mentioned item (B), the respective adjustment means 2 are instructed by the control means 7, so that the respective amplitudes R 1 and R AV and the standard deviations σ 1 and σ AV satisfy the above condition: R 1 ≦ 2.0 (μm), R AV ≦ 1.0 (μm), σ 1 ≦ 0.5 (μm), and σ AV ≦ 0.2 (μm), it is important to adjust the thickness of the film independently in each interval.

再者,在本發明中,針對算出振幅(R1)及標準偏差(σ1),係以每次製作一個測量厚度剖面,使用其最新之測量厚度剖面,算出振幅(R1)及標準偏差(σ1)為佳。 Further, in the present invention, for calculating the amplitude (R 1 ) and the standard deviation (σ 1 ), one measurement thickness profile is created each time, and the latest measured thickness profile is used to calculate the amplitude (R 1 ) and the standard deviation. (σ 1 ) is preferred.

對於振幅(RAV)及標準偏差(σAV)之算出係使用最新之100個之測量厚度剖面,依序算出振幅(RAV)及標準偏差(σAV)為佳。 For the calculation of the amplitude (R AV ) and the standard deviation (σ AV ), the latest 100 measured thickness profiles are used, and the amplitude (R AV ) and the standard deviation (σ AV ) are preferably calculated in order.

例如,於最新之測量厚度剖面係在第1200號被製作出之情況下,使用在該第1200號被製作出之測量厚度剖面算出振幅(R1)及標準偏差(σ1),並且使用之前所製作的第1101至1200號的100個測量厚度剖面,算出振幅(RAV)及標準偏差(σAV)。 For example, in the case where the latest measured thickness profile is created in No. 1200, the amplitude (R 1 ) and the standard deviation (σ 1 ) are calculated using the measured thickness profile produced in No. 1200, and before use. The amplitude (R AV ) and the standard deviation (σ AV ) of the 100 measured thickness profiles of the created No. 1101 to 1200 were calculated.

「振幅(R1)」係從上述一次的測量厚度剖面所算出者,詳細而言為一次測量厚度剖面中之各調整手段1區間(或是所對應之各測量區間)之薄膜厚度測量值之最大值和最小值的差。 The "amplitude (R 1 )" is calculated from the measured thickness profile of the first time, and is, in detail, the film thickness measurement value of each of the adjustment means 1 intervals (or the corresponding measurement sections) in the thickness measurement section. The difference between the maximum and minimum values.

並且,在發明中,「一次之測量厚度剖面」係指以上述操作所製作出之測量厚度剖面之任一個,最佳為意味著一個最新之測量厚度剖面。 Further, in the invention, the "measured thickness profile once" means any one of the measured thickness profiles produced by the above operation, and preferably means a newest measured thickness profile.

再者,在本發明中,振幅(R1)係表示一次之測量厚度剖面中之薄膜厚度之精度。 Further, in the present invention, the amplitude (R 1 ) represents the accuracy of the film thickness in the measured thickness profile at one time.

在本發明中,振幅(R1)為2.0μm以下,最佳為1.5μm以下,更佳為1.0μm以下。 In the present invention, the amplitude (R 1 ) is 2.0 μm or less, preferably 1.5 μm or less, more preferably 1.0 μm or less.

再者,當振幅(R1)大於2.0μm時,厚度調整手段2之每一次調整之條件變更變大,進而容易受到振盪(hunting)等之影響,使得之後的厚度之調整能下降,進而難以取得高的厚度精度。 In addition, when the amplitude (R 1 ) is more than 2.0 μm, the condition of each adjustment of the thickness adjustment means 2 is changed to be large, and it is likely to be affected by hunting or the like, so that the subsequent adjustment of the thickness can be lowered, which is difficult. Achieve high thickness accuracy.

「標準偏差(σ1)」係從上述一次的測量厚度剖面所算出者,詳細而言為一次測量厚度剖面中之各調整手段1區間(或是所對應之各測量區間)之薄膜厚度測量值之標準偏差之值。 The "standard deviation (σ 1 )" is calculated from the above-mentioned measured thickness profile, and is specifically the film thickness measurement value of each adjustment means 1 section (or the corresponding measurement section) in the thickness measurement section. The value of the standard deviation.

標準偏差(σ1)為0.5μm以下,最佳為0.4μm以下,更佳為0.3μm以下。 The standard deviation (σ1) is 0.5 μm or less, preferably 0.4 μm or less, more preferably 0.3 μm or less.

再者,當標準偏差(σ1)大於0.5μm時,設置在模具1之每區間的厚度調整手段2各進行模唇間隙之調整時,例如在接近的兩個區間實施調整之時,在該些區間之間的條件變更之差變大,由於接近之調整手段之條件變更互相受到影響,故各區間之調整能力下降,厚度調整可能需要時間,並且有陷入無法控制振盪等之狀態。 Further, when the standard deviation (σ 1 ) is larger than 0.5 μm, when the thickness adjustment means 2 provided in each section of the mold 1 adjusts the lip gap, for example, when adjustment is performed in two adjacent sections, The difference in conditional change between the sections becomes large, and since the conditional changes of the approaching adjustment means are mutually affected, the adjustment ability of each section is lowered, the thickness adjustment may take time, and there is a state in which the oscillation cannot be controlled.

「振幅(RAV)」係從上述累計平均剖面所算出,詳細而言,累計平均剖面中之各調整手段1區間(或是所對應之各測量區間)之薄膜厚度(即是,連續100個之測量厚度剖面之各區間的薄膜之移行方向(或是捲繞方向)中之薄膜厚度測量值之平均值)之最大值和最小值之差。 The "amplitude (R AV )" is calculated from the cumulative average cross section, and in detail, the film thickness of each of the adjustment means 1 intervals (or the corresponding measurement sections) in the cumulative average section (that is, 100 consecutive) The difference between the maximum value and the minimum value of the average value of the film thickness measurement values in the traveling direction (or the winding direction) of the film in each section of the thickness profile is measured.

在本發明中,振幅(RAV)係意味著薄膜被捲成薄膜卷材之時之捲繞方向之薄膜厚度累計值之偏差寬度。 In the present invention, the amplitude (R AV ) means the deviation width of the film thickness cumulative value in the winding direction when the film is wound into a film web.

因此,振幅(RAV)之值越大,意味著產生暴筋等之捲取時不良情形的可能性變大,振幅(RAV)之值越小,產生暴筋等之捲取時之不良情形的可能性變小。 Therefore, the larger the value of the amplitude (R AV ), the greater the possibility of occurrence of a problem in the winding of the ribs or the like, and the smaller the value of the amplitude (R AV ), resulting in a defect in the winding of the ribs or the like. The possibility of the situation becomes smaller.

再者,振幅(RAV)越小,在之後的100次之厚度測量中持續一次之厚度測量中之偏差寬度之時,100次之累計值之平均偏差寬則與該一次之厚度測量之時的偏差寬度相同。 Furthermore, the smaller the amplitude (R AV ), the longer the deviation width of the cumulative value of 100 times in the thickness measurement of the next 100 times, and the time when the thickness is measured once. The deviation width is the same.

振幅(RAV)為1.0μm以下,最佳為0.9μm以下,更 佳為0.8μm以下。 The amplitude (R AV ) is 1.0 μm or less, preferably 0.9 μm or less, more preferably 0.8 μm or less.

再者,當RAV大於1.0μm時,在薄膜卷材中,產生暴筋等之可能性變高。 Further, when R AV is more than 1.0 μm, there is a high possibility that ribs or the like are generated in the film web.

並且,在本發明中,在藉由100次之掃描(scan)進行的薄膜厚度之測量所花費之時間內,使用調整手段2在每區間調整薄膜厚度,依此可以達成上述條件:RAV≦1.0μm。 Further, in the present invention, the film thickness is adjusted in each interval by the adjustment means 2 in the time taken for the measurement of the film thickness by 100 scans, whereby the above condition can be achieved: R AV ≦ 1.0 μm.

「標準偏差(σAV)」係從上述累計平均剖面所算出,詳細而言,從累計平均剖面中之各調整手段1區間(或是所對應之各測量區間)之薄膜厚度(即是,連續100個之測量厚度剖面之各區間的薄膜之移行方向(或是捲繞方向)中之薄膜厚度測量值之平均值)所算出之標準偏差之值。 The "standard deviation (σ AV )" is calculated from the cumulative average cross section, and in detail, the film thickness (i.e., continuous) of each of the adjustment means 1 intervals (or the corresponding measurement sections) in the cumulative average profile The value of the standard deviation calculated from the average of the film thickness measurements in the direction of travel (or the winding direction) of the film in each of the 100 thickness profiles.

在本發明中,標準偏差(σAV)為0.2μm以下。 In the present invention, the standard deviation (σ AV ) is 0.2 μm or less.

當標準偏差(σAV)大於0.2μm時,即是在最終之捲取型態中,於薄膜厚度之累計值產生大的偏差,係指還未到產生爆筋等,產生了捲取的鬆緊差之意,在緊的部分,產生金字塔等之凹凸,在鬆的部分產生縐摺等,在表面處理等之後加工中,表面品質下降之可能性變高。 When the standard deviation (σ AV ) is larger than 0.2 μm, that is, in the final coiling type, a large deviation occurs in the cumulative value of the film thickness, which means that the ribs have not yet been generated, and the winding is tight. In the tight part, the unevenness of the pyramid or the like is generated, and the loose portion or the like is formed in the loose portion, and the surface quality is likely to be lowered during the processing such as the surface treatment.

再者,在本發明中,在藉由100次之掃描(scan)進行的薄膜厚度之測量所花費之時間內,使用調整手段2在每區間調整薄膜厚度,依此可以達成上述條件:σAV≦0.2σm。 Further, in the present invention, the film thickness is adjusted in each interval by the adjustment means 2 during the time taken for the measurement of the film thickness by 100 scans, whereby the above condition can be achieved: σ AV ≦0.2σm.

並且,在上述工程(B)中之薄膜厚度之調整 中,如上述般,測量厚度剖面係根據一個或其以上之個別厚度剖面而製作出,並且該測量厚度剖面中之薄膜厚度在某區間,判斷出大於期待厚度剖面之薄膜厚度之時,調整模唇間隙,使接下來被製作出之測量厚度剖面之厚度,在其區間,與期待厚度剖面一致或接近。 And, the film thickness adjustment in the above project (B) In the above, the measured thickness profile is formed according to one or more individual thickness profiles, and the film thickness in the measured thickness profile is determined in a certain interval, and when the film thickness is greater than the expected thickness profile, the mode is adjusted. The lip gap is such that the thickness of the measured thickness profile that is subsequently produced is consistent or close to the expected thickness profile in the interval.

再者,此時,在本發明中,以縮小測量厚度剖面之薄膜厚度之偏差寬度為目的,將「逆符號剖面」設定為設定厚度剖面,在上述特定之標準偏差之數值範圍內,以故意產生厚度之薄部分之方式,隨時從控制手段7對各調整手段2給予指示為佳。 Further, in the present invention, in order to reduce the variation width of the film thickness of the thickness profile, the "reverse symbol profile" is set to the set thickness profile, and the value is within the numerical range of the specific standard deviation described above. It is preferable to give an indication to each of the adjustment means 2 from the control means 7 at any time in such a manner as to produce a thin portion of the thickness.

在此,針對在本發明中可以使用之「逆符號剖面」又加以詳細說明。 Here, the "inverse symbol profile" which can be used in the present invention will be described in detail.

在本發明中,「逆符號剖面」係如第2圖所示般,將測量厚度剖面之薄膜厚度之值,和期待厚度剖面之薄膜厚度之值的差(△T=「測量厚度剖面之薄膜厚度之值」-「期待厚度剖面之薄膜厚度之值」)之值的符號成為相反而繪製。 In the present invention, the "inverse symbol profile" is the difference between the value of the film thickness of the thickness profile and the film thickness of the desired thickness profile as shown in Fig. 2 (ΔT = "film for measuring the thickness profile" The value of the value of the thickness "-"the value of the film thickness of the thickness profile is expected" is plotted against the opposite.

因此,逆符號剖面和測量厚度剖面之關係係如第2圖所示般,以期待厚度剖面為中心具有對稱之關係。 Therefore, the relationship between the inverse symbol profile and the measured thickness profile is as shown in Fig. 2, and has a symmetrical relationship centering on the expected thickness profile.

例如,將薄膜之製品期待厚度(TP)設定成100μm,測量厚度剖面中之某測量部位(或測量點)之薄膜厚度之測量值(TM)為101μm之情況下,該實測值(TM)和期待厚度之值(TP)之差(△T=TM-TP)成為「+1μm」。此時之符號「+(正)」,其逆符號為「-(負)」,此時 之逆符號剖面之厚度之值成為「-1μm」。 For example, when the expected thickness (T P ) of the film product is set to 100 μm, and the measured value (T M ) of the film thickness of a certain measurement portion (or measurement point) in the thickness profile is 101 μm, the measured value (T) is measured. The difference between the value of M ) and the expected thickness (T P ) (ΔT = T M - T P ) becomes "+1 μm". At this time, the symbol "+ (positive)" has an inverse sign of "-(negative)", and the value of the thickness of the inverse symbol cross section at this time is "-1 μm".

再者,在此,於薄膜製膜開始時之薄膜厚度之調整(初期調整)中,至少在與各厚度調整手段之各區間對應之薄膜測量區間中,實施薄膜厚度之測量,成為其調整目標之製膜當初的設定值,為期待厚度(或是期待厚度剖面)。 Here, in the film thickness adjustment (initial adjustment) at the start of film formation, the film thickness measurement is performed at least in the film measurement section corresponding to each section of each thickness adjustment means, and the adjustment target is obtained. The initial set value of the film formation is the expected thickness (or the expected thickness profile).

但是,例如將設定厚度剖面設定成期待厚度剖面,如第3圖所示般,在某期間的相加平均厚度剖面(例如,將實施薄膜厚度精度之初期調整之後,到某時點之測量厚度剖面予以相加平均而算出之剖面)為剖面(i),之後所製作出之測量厚度剖面為剖面(ii)之時,之後所製作之相加平均厚度剖面(即是,將從實施薄膜厚度精度之初期調整之後,至製作剖面(ii)之時點的測量厚度剖面予以相加平均而算出之剖面),成為第3圖之剖面(iii)般。 However, for example, the set thickness profile is set to the desired thickness profile, and as shown in FIG. 3, the average thickness profile is added for a certain period of time (for example, after the initial adjustment of the film thickness precision is performed, the thickness profile is measured at a certain point in time). The cross section calculated by adding and averaging is the cross section (i), and the measured thickness profile produced after that is the cross section (ii), and then the summed average thickness profile (that is, the film thickness precision will be obtained from the film thickness) After the initial adjustment, the profile obtained by adding and averaging the measured thickness profiles at the time of the production of the section (ii) is the same as the section (iii) of FIG.

因此,如此相加平均厚度剖面係表示接近於每次製作時為了算出而重新被加的測量厚度剖面之舉動,一般而言,幾乎無薄膜上之所有測量部位(或是測量點)之厚度與期待厚度完全一致之情形,因此,最終的相加平均厚度剖面(即是,將實施薄膜厚度精度之初期調整之後至薄膜之捲取結束之時點的測量厚度剖面予以相加平均而算出之剖面),幾乎不與期待厚度剖面一致。 Therefore, the sum of the average thickness profiles thus indicates a behavior close to the measured thickness profile that is newly added for each calculation at the time of production. In general, there is almost no thickness of all measurement sites (or measurement points) on the film. It is expected that the thicknesses are completely the same, and therefore, the final addition average thickness profile (that is, the profile obtained by adding and averaging the measured thickness profiles at the time of the initial adjustment of the film thickness precision to the end of the winding of the film) It is hardly consistent with the expected thickness profile.

在此,在本發明中,如同上述般,在薄膜厚度之調整中,根據一個或其以上之個別厚度剖面而所製作出之測量厚度剖面中,於判斷薄膜之厚度大於期待之厚度 之情況下,不僅用以將此接近於期待厚度之上述般之調整,測量厚度剖面之薄膜厚度之累計的結果,使其平均之薄膜厚度的振幅變小為目的,設定逆符號剖面以作為設定厚度剖面,以在上述特定標準偏差之數值範圍內故意產生厚度薄之部分之方式,從控制手段7調整手段2各給予指示為佳。如此一來,藉由進行厚度之調整,如此之累計平均剖面成為極接近於期待厚度剖面,或一致,可以取得薄膜厚度之均勻性,進行提升薄膜卷材之外觀品質。 Here, in the present invention, as in the above, in the adjustment of the film thickness, in the measured thickness profile formed according to one or more individual thickness profiles, it is judged that the thickness of the film is larger than the expected thickness. In this case, it is not only used to adjust the thickness of the film thickness close to the expected thickness, but also to reduce the amplitude of the film thickness of the average thickness, and to set the inverse symbol profile as the setting. In the thickness profile, it is preferable to give an instruction from the control means 7 to the adjustment means 2 in such a manner that the thin portion is deliberately generated within the numerical range of the above-mentioned specific standard deviation. In this way, by adjusting the thickness, the cumulative average cross-section is extremely close to the expected thickness profile, or uniform, and the uniformity of the film thickness can be obtained, and the appearance quality of the film roll can be improved.

再者,如此之逆符號剖面可以根據一個或其以上之個別厚度剖面而作製的上述測量厚度剖面而製作。再者,其設定係在控制手段7中能自動性進行。 Furthermore, such an inverted symbol profile can be made from the above-described measured thickness profile made from one or more individual thickness profiles. Furthermore, the setting can be automatically performed in the control means 7.

但是,每次根據一個厚度剖面製作一個測量厚度剖面,設定成根據其測量厚度剖面製作逆符號剖面時,增加控制手段7所含之控制機器之繁雜性,造成功能性之負擔,並且有產生反映測量誤差等之問題之虞。因此,每次至少根據兩個以上,較佳為10個以上,更佳20個以上,最佳為30個以上之個別厚度剖面製作測量厚度剖面,根據其測量厚度剖面,設定成製作出所對應的逆符號面為佳。 However, each time a thickness profile is made from a thickness profile, and the inverse symbol profile is created based on the measured thickness profile, the complexity of the control device included in the control means 7 is increased, resulting in a functional burden and a reflection. Problems such as measurement errors. Therefore, at least two or more, preferably 10 or more, more preferably 20 or more, and preferably 30 or more individual thickness profiles are prepared for each thickness profile, and the thickness profile is measured according to the measured thickness profile. The inverse sign surface is preferred.

再者,與此相反,每次根據過多的個別厚度剖面,例如1000個的個別厚度剖面製作測量厚度剖面,設定成製作與測量厚度剖面對應之逆符號剖面時,製作一個所需數量之個別厚度剖面及根據此之測量厚度剖面所花費之時間變長,此為原因,在該期間有產生因累計厚度所引起之暴 筋等的不良情形之虞。 Furthermore, in contrast, each time a measured thickness profile is made from too many individual thickness profiles, for example 1000 individual thickness profiles, and is set to produce an inverse symbol profile corresponding to the measured thickness profile, a desired number of individual thicknesses are made. The time taken for the profile and the thickness profile to be measured according to this becomes longer, which is the reason why during this period there is a storm caused by the cumulative thickness. The ills of the ribs and the like.

因此,製作測量厚度剖面之時所使用之個別厚度剖面之數量,可因應製作一個個別厚度剖面所需之時間,及製作一個測量厚度剖面所需之時間,和薄膜製品之捲取時間(製作一條薄膜卷材之時間),而適當設定。 Therefore, the number of individual thickness profiles used in the measurement of the thickness profile can be determined by the time required to produce a single thickness profile, the time required to produce a thickness profile, and the take-up time of the film product (making a The time of the film web) is appropriately set.

並且,就以薄膜厚度之調整手段而言,例如可以使用上述之熱螺栓方式之致動器,此時,因藉由因應電熱量使螺栓伸縮而在各區間調整唇部間隙來調整薄膜之厚度,故從設定逆符號剖面到開始薄膜厚度之調整為止之時間(反應時間)變長,因此有產生被稱為振盪之控制延遲的情形。 Further, in the film thickness adjusting means, for example, the above-described heat bolt type actuator can be used. In this case, the thickness of the film is adjusted by adjusting the lip gap in each section by expanding and contracting the bolt in response to electric heat. Therefore, since the time (reaction time) from the setting of the inverse symbol cross section to the start of the adjustment of the film thickness becomes long, there is a case where a control delay called oscillation is generated.

因此,鑒於如此之時間,以事先決定製作逆符號剖面所使用之個別厚度剖面之數量為佳。 Therefore, in view of such time, it is preferable to determine in advance the number of individual thickness profiles used for making the inverse symbol profile.

再者,同樣之理由,作為逆符號剖面之設定數值,則以對厚度差(△T)事先加上或減去振盪所造成之控制延遲部分的厚度之振幅具有效果。 Further, for the same reason, as the set value of the inverse symbol cross section, it is effective to add or subtract the amplitude of the thickness of the control delay portion caused by the oscillation in advance to the thickness difference (ΔT).

如此所取得之薄膜卷材係在例如液晶顯示裝置或電漿顯示器等之平面顯示器中,可以適當作為光擴散薄膜、用以保護平面顯示器之構成構件之表面的保護膜,或偏光板所含之偏光子之保護膜等之材料而使用。 The film roll thus obtained is suitably used as a light diffusing film, a protective film for protecting the surface of a constituent member of a flat display, or a polarizing plate, in a flat display such as a liquid crystal display device or a plasma display. It is used as a material such as a protective film of a polarizer.

〔實施例〕 [Examples]

以下,雖然針對本發明之實施例予以說明,但是本發明並不限定於該些實施例。 Hereinafter, the embodiments of the present invention will be described, but the present invention is not limited to the embodiments.

(實施例1) (Example 1)

就以熱可塑性樹脂而言,使用混合含有丙烯酸之聚甲基丙烯酸甲酯(PMMA)系樹脂(住友化學(股)製造的「SUMIPEX HT01X」30重量份,和聚甲基丙烯酸甲酯(PMMA)系樹脂(住友化學(股)製造的「SUMIPEX EX」70重量份而所取得之丙烯酸系樹脂。 For the thermoplastic resin, 30 parts by weight of "SUMIPEX HT01X" manufactured by Sumitomo Chemical Co., Ltd. and polymethyl methacrylate (PMMA) were mixed with a polymethyl methacrylate (PMMA) resin containing acrylic acid. Acrylic resin obtained by using 70 parts by weight of "SUMIPEX EX" manufactured by Sumitomo Chemical Co., Ltd.

如第1圖所示般,配置模具1、調整手段2、輥3、3’及3”、薄膜之厚度的測量器5、薄膜卷材6及控制手段7,並且在測量器5和薄膜卷材6之間配置有分條機(無圖示)。 As shown in Fig. 1, the mold 1, the adjustment means 2, the rolls 3, 3' and 3", the thickness of the film, the measuring device 5, the film web 6 and the control means 7, and the measuring device 5 and the film roll are arranged. A slitter (not shown) is disposed between the materials 6.

作為模具1,使用模具寬為1650mm者,沿著模具1之模唇寬,配置藉由沿著其模唇寬(1650mm)而以25mm間隔具有65根的螺栓之熱螺栓方式之致動器的厚度調整手段。作為測量器5,使用放射線透過型之厚度測量器,在與薄膜之移行方向正交之薄膜寬方向,將其測量間隔設為5mm間隔。再者,將該薄膜之製品有效寬設為1250mm。 As the mold 1, a mold having a mold width of 1,650 mm, along the die lip width of the mold 1, is provided with a heat bolt type actuator having 65 bolts at intervals of 25 mm along its lip width (1650 mm). Thickness adjustment means. As the measuring device 5, a radiation transmission type thickness measuring device was used, and the measurement interval was set to 5 mm intervals in the film width direction orthogonal to the film moving direction. Further, the effective width of the product of the film was set to 1250 mm.

在控制手段7中,根據從測量器5發送之測量資料,根據一次分之測量資料,即是在寬方向進行從薄膜之端部至端部的一次掃描(scan)而進行測量所取得之資料,製作一個個別厚度剖面,且根據該一個個別厚度剖面,製作一個測量厚度剖面。接著,於每次如此地製作測量厚度剖面,以在各區間將所製作出之最新測量厚度剖面與當作設 定厚度剖面所選擇出之期待厚度剖面(厚度為80μm且一定之剖面)比對,之後製作出之測量厚度剖面在各區間與期待厚度剖面一致之方式,設定成從控制手段7對各調整手段2各發出指示。並且,與此並行,以滿足以下之條件:R1≦2.0μm、RAV≦1.0μm、σ1≦0.5μm及σAV≦0.2μm之方式,又設定成從控制手段7對各調整手段各發出指示。 In the control means 7, based on the measurement data transmitted from the measuring device 5, the measurement data obtained by performing the measurement from the end portion to the end portion of the film in the width direction is performed based on the measurement data once divided. , making an individual thickness profile and making a measured thickness profile based on the one individual thickness profile. Next, the measured thickness profile is prepared in such a manner that the latest measured thickness profile produced in each section is compared with the expected thickness profile (thickness of 80 μm and a constant profile) selected as the set thickness profile. The measured thickness profile produced thereafter is set so that each of the adjustment means 2 is instructed from the control means 7 so that each section coincides with the expected thickness profile. Further, in parallel with this, the following conditions are satisfied: R 1 ≦ 2.0 μm, R AV ≦ 1.0 μm, σ 1 ≦ 0.5 μm, and σ AV ≦ 0.2 μm, and each of the adjustment means is set from the control means 7 Give instructions.

並且,在控制手段7中,根據個別厚度剖面製作測量厚度剖面之時,將從測量器5被發送至控制手段7之測量資料中,對應於調整手段(即是螺栓)1區間的5點薄膜厚度測量值之平均值當作如此之1區間的測量值,設定成製作測量厚度剖面。 Further, in the control means 7, when the thickness profile is measured from the individual thickness profile, the measurement data transmitted from the measuring device 5 to the control means 7 corresponds to the 5-point film of the adjustment means (i.e., the bolt) 1 section. The average value of the thickness measurement values is taken as the measurement value of such a section, and is set to produce a measurement thickness profile.

在此,製造熱可塑性樹脂薄膜,具體而言如下述般。 Here, a thermoplastic resin film is produced, specifically, the following.

首先,使用一軸擠壓(日立造船(股)製作,螺桿徑:130mm φ)從模具寬1650mm的模具(模唇寬:1650mm),將上述丙烯酸系樹脂熔融擠壓成薄膜狀,在兩根輥3及3’之間夾入樹脂,並且以接觸於另一根的冷卻輥3”之方式,將樹脂予以成形及固化,而取得期待之製品厚度(基準厚度)80μm之熱可塑性樹脂薄膜。 First, a one-axis extrusion (manufactured by Hitachi Shipbuilding Co., Ltd., screw diameter: 130 mm φ) was used to melt-extrude the above-mentioned acrylic resin into a film shape from a mold having a mold width of 1,650 mm (die width: 1650 mm). The resin was sandwiched between 3 and 3', and the resin was molded and solidified in contact with the other cooling roll 3" to obtain a thermoplastic resin film having a desired product thickness (reference thickness) of 80 μm.

並且,在此的熱可塑性樹脂薄膜之厚度係在寬方向切割所成形之熱可塑性樹脂薄膜,藉由測微計,在寬方向以等間隔測量20點製品有效寬內之厚度,為該所測量之20點的厚度平均值。 Further, the thickness of the thermoplastic resin film here is a thermoplastic resin film which is formed by cutting in a wide direction, and the thickness of the effective width of the 20-point product is measured at equal intervals in the width direction by a micrometer, and the thickness is measured. The average thickness of 20 points.

並且,以手動調整,將薄膜厚度精度初期調整成±2μm左右。 Further, the film thickness accuracy was initially adjusted to about ±2 μm by manual adjustment.

再者,從模具1650mm之模具(模唇寬:1650mm)所取得之熱可塑性樹脂薄膜之全寬約為1450mm。 Further, the thermoplastic resin film obtained from a mold of 1650 mm (mold lip width: 1650 mm) has a full width of about 1450 mm.

使該熱可塑性樹脂薄膜通過冷卻輥3”之後,在薄膜移行中,使用放射線透過型之厚度測量器5,在各測量點(間隔:5mm),重複進行從薄膜之一方之端部至另一方之端部掃描(scan)薄膜之厚度而測量薄膜厚度,接著,連續從該另一方之端部掃描(scan)至一方之端部的薄膜厚度測量。將該測量資料全部發送至控制手段7,隨著上述設定,每進行一次薄膜之寬方向之厚度的掃描測量(即是,每從薄膜寬度之一方之端部掃描至另一方之端部,或是從另一方之端部掃描至一方之端部而進行測量),各分別製作個別厚度剖面及測量厚度剖面,在每個區間控制設置在模具1之調整手段2)。 After the thermoplastic resin film was passed through the cooling roll 3", the radiation-transmissive thickness measuring device 5 was used to transfer the film from one end of the film to the other at each measuring point (interval: 5 mm). The end portion scans the thickness of the film to measure the film thickness, and then continuously scans from the other end portion to the film thickness measurement at one end portion. The measurement data is all sent to the control means 7, With the above setting, the scanning measurement of the thickness in the width direction of the film is performed once (that is, each end scanning from one end of the film width to the other end, or scanning from the other end to one side) The end portion is measured. Each of the individual thickness profiles and the measured thickness profile are separately produced, and the adjustment means 2) provided in the mold 1 is controlled in each section.

通過放射線透過型之厚度測量器5之薄膜4,之後以藉由分條機使薄膜之寬度成為製品有效寬(1250mm)之方式,薄膜之兩端部被分條(切割),利用捲取機被捲取,最終在輥芯(直徑:152.4mm)捲取全長2000m之薄膜,製作出薄膜卷材6。 The film is passed through the film 4 of the thickness measuring device 5, and then the width of the film is made into a width (1250 mm) by the slitter, and the both ends of the film are slit (cut) using a coiler. The film was taken up, and finally a film of a total length of 2000 m was taken up in a roll core (diameter: 152.4 mm) to prepare a film roll 6.

針對如上述般根據於實施薄膜之厚度精度之初期調整之後,至成為最終之薄膜卷材為止之期間被製作之測量厚度剖面而所算出之振幅(R1)及標準偏差(σ1),和振幅(RAV)及標準偏差(σAV),於以下表1 各表示將全部所算出之值予以相加平均者。 The amplitude (R 1 ) and the standard deviation (σ 1 ) calculated by measuring the thickness profile obtained during the initial adjustment of the thickness of the film after the initial adjustment of the thickness of the film as described above, and The amplitude (R AV ) and the standard deviation (σ AV ) are shown in Table 1 below for the average of all the calculated values.

並且,在實施例1中,從實施薄膜厚度精度之初期調整之後至取得最終之薄膜卷材為止之期間所製作之測量厚度剖面之數量為200個。 Further, in the first embodiment, the number of measured thickness profiles produced from the initial adjustment of the film thickness precision to the time of obtaining the final film web was 200.

(實施例2) (Example 2)

在上述實施例1中,除了以將作為設定厚度剖面所選擇出之期待厚度剖面(即是,厚度為80μm且一定之剖面),代替逆符號剖面,然後根據20個之個別厚度剖面製作一個測量厚度剖面之方式,變更設定之外,其他與上述實施例1相同,製作出薄膜卷材。 In the above-described first embodiment, in addition to the desired thickness profile selected as the set thickness profile (that is, the thickness is 80 μm and a certain profile), instead of the inverse symbol profile, a measurement is made based on the 20 individual thickness profiles. A film web was produced in the same manner as in the above-described first embodiment except for the thickness profile.

針對根據於實施薄膜之厚度精度之初期調整之後,至成為最終之薄膜卷材為止之期間被製作之測量厚度剖面而所算出之振幅(R1)及標準偏差(σ1),和振幅(RAV)及標準偏差(σAV),於以下表1各表示將全部所算出之值予以相加平均者。 The amplitude (R 1 ) and the standard deviation (σ 1 ) and the amplitude (R) calculated from the measured thickness profile prepared after the initial adjustment of the thickness accuracy of the film to the final film roll. AV ) and standard deviation (σ AV ) are shown in Table 1 below for the average of all the calculated values.

並且,在實施例2中,從實施薄膜厚度精度之初期調整之後至取得最終之薄膜卷材為止之期間所製作之測量厚度剖面之數量為200個。 Further, in the second embodiment, the number of measured thickness profiles produced from the initial adjustment of the film thickness precision to the time of obtaining the final film web was 200.

(比較例1) (Comparative Example 1)

除變更設定成在上述實施例1中,不進行藉由手動的初期厚度之調整,R1、RAV、σ1及σAV各滿足以下之條件:R1≦4.0μm、RAV≦2.0μm、σ1≦1.0μm,及σAV≦0.5 μm之方式,變更設定從控制手段7對調整手段2發出指示之外,其他藉由與上述實施例1相同之方法,製造出薄膜卷材。 Unless otherwise changed, in the first embodiment, the initial thickness adjustment by manual is not performed, and each of R 1 , R AV , σ 1 , and σ AV satisfies the following conditions: R 1 ≦ 4.0 μm, R AV ≦ 2.0 μm. In the same manner as in the above-described first embodiment, a film web was produced by changing the setting from the control means 7 to the adjustment means 2 in a manner of σ 1 ≦ 1.0 μm and σ AV ≦ 0.5 μm.

針對根據至最終製造出薄膜卷材為止所製作的測量厚度剖面而算出之振幅(R1)及標準偏差(σ1),和振幅(RAV)及標準偏差(σAV),於以下表1各表示將全部所算出之值予以相加平均者。 The amplitude (R 1 ) and the standard deviation (σ 1 ), and the amplitude (R AV ) and the standard deviation (σ AV ) calculated from the measured thickness profile prepared until the final production of the film web are shown in Table 1 below. Each represents the sum of all the calculated values.

並且,在比較例1中,至最終製造薄膜卷材為止所製作的測量厚度剖面之數量為200個。 Further, in Comparative Example 1, the number of measured thickness profiles prepared up to the final production of the film web was 200.

(評估手段) (assessment means)

外觀:針對在上述實施例及比較例所製造出之薄膜卷材,以目視檢查期薄膜外觀,在薄膜卷材表面完全無暴筋或金字塔之問題者評估成「◎」。再者,雖然有些許金字塔模樣的凹凸,但是將不會對之後的後加工產生影響之程度者評估為「○」。然後,將同時明顯產生金字塔和暴筋者評估為「×」。 Appearance: For the film webs produced in the above Examples and Comparative Examples, the appearance of the film was visually inspected, and the problem of no gluten or pyramid on the surface of the film web was evaluated as "◎". In addition, although there are some irregularities of the pyramid shape, the degree of influence on the subsequent post-processing is evaluated as "○". Then, the person who apparently produces the pyramid and the ribs is evaluated as "X".

如上述般,在本發明中,在寬方向掃描測量移行中之薄膜的厚度而製作個別厚度剖面,根據一個或其以上之個別厚度剖面(在實施例1中為1個,在實施例2中為20個之個別厚度剖面)製作測量厚度剖面,並且將該測量厚度剖面與設定厚度剖面(在實施例1中為期待厚度剖面,在實施例2中為逆符號剖面),根據其結果,在每區間獨立調整薄膜之厚度。然後,與此並行,根據連續製作之100個之測量厚度剖面,以各滿足R1≦2.0μm、RAV≦1.0μm、σ1≦0.5μm及σAV≦0.2μm之條件,在各區間調整薄膜之厚度,依此在本發明中,如表1所示般,不利用振盪,可以製造出外觀優良的薄膜卷材。 As described above, in the present invention, the thickness of the film in the transition is measured in the wide direction to produce individual thickness profiles, according to one or more individual thickness profiles (one in the embodiment 1, in the second embodiment) A measured thickness profile is produced for each of 20 individual thickness profiles, and the measured thickness profile and the set thickness profile (the expected thickness profile in Example 1 and the inverse symbol profile in Example 2) are based on the results. The thickness of the film is independently adjusted for each interval. Then, in parallel with this, according to the 100 measured thickness profiles continuously produced, each of the intervals is adjusted under the conditions of satisfying R 1 ≦ 2.0 μm, R AV ≦ 1.0 μm, σ 1 ≦ 0.5 μm, and σ AV ≦ 0.2 μm. As a result of the thickness of the film, in the present invention, as shown in Table 1, a film roll excellent in appearance can be produced without using vibration.

尤其,在實施例2中,可以製造出完全無暴筋或金字塔等之外觀上之問題的薄模卷材。 In particular, in Embodiment 2, it is possible to manufacture a thin-moulded web which is completely free from the appearance problems of ribs or pyramids and the like.

再者,在實施例2中,將使用於製作測量厚度剖面之個別厚度剖面之數量設為20個(並且,在實施例1中,使用於製作測量厚度剖面之個別厚度剖面之數量為一個),並且就以設定厚度剖面而言,藉由使用逆符號剖面,顯著地改善薄膜卷材外觀。 Furthermore, in the second embodiment, the number of individual thickness profiles used for the measurement of the thickness profile is set to 20 (and, in the embodiment 1, the number of individual thickness profiles used for the measurement of the thickness profile is one) And, in terms of setting the thickness profile, the appearance of the film web is remarkably improved by using the inverse symbol profile.

對此,在比較例1中,雖然與實施例1、2相同,根據測量厚度剖面而進行薄膜厚度之調整,但是所製造出之薄膜卷材產生爆筋及金字塔,無法取得良好之薄膜卷材之外觀。 On the other hand, in Comparative Example 1, although the film thickness was adjusted in accordance with the measurement of the thickness profile in the same manner as in Examples 1 and 2, the film roll produced had a rib and a pyramid, and a good film web could not be obtained. The appearance.

如此一來,藉由使用本發明之製造方法,可以製造出外觀優良之薄膜卷材。 As a result, by using the production method of the present invention, a film web having an excellent appearance can be produced.

本案發明係以2012年5月18日於日本申請之特願2012-114439號為基礎而主張其優先權,其內容全部藉由在本說明書中參照而被援用。 The present invention claims priority based on Japanese Patent Application No. 2012-114439, the entire disclosure of which is incorporated herein by reference.

1‧‧‧模具 1‧‧‧Mold

2‧‧‧調整手段 2‧‧‧Adjustment means

3‧‧‧鑄造輥 3‧‧‧ casting rolls

3’‧‧‧鑄造輥(或是對向輥) 3'‧‧‧ casting rolls (or counter rolls)

3”‧‧‧鑄造輥(或是冷卻輥) 3"‧‧‧ casting rolls (or cooling rolls)

4‧‧‧熱可塑性樹脂薄膜 4‧‧‧ thermoplastic resin film

5‧‧‧厚度測量器 5‧‧‧ thickness gauge

6‧‧‧薄膜卷材 6‧‧‧ film coil

7‧‧‧控制手段 7‧‧‧Control means

Claims (6)

一種薄膜卷材之製造方法,該薄膜卷材之製造方法之特徵為:包含以下之工程(A)~(C):(A)從具備唇部間隙(lip gap)之調整手段的模具擠壓熱可塑性樹脂,且邊移行邊製膜,而形成薄膜之工程;(B)在該薄膜之移行中,調整該薄膜之厚度的工程,即重複下述之步驟(a)~(c),而調整薄膜之厚度的工程,(a)在與該薄膜之移行方向正交之該薄膜之寬方向,以特定間隔測量該移行中之薄膜的厚度,作製個別厚度剖面之步驟,(b)根據一個或其以上之該個別厚度剖面,製作測量厚度剖面之步驟,(c)根據該測量厚度剖面,和設定厚度剖面,調整該模具之唇部間隙之步驟;(C)將薄膜捲成捲筒狀之工程,在該工程(B)中,以滿足下述之條件之方式,又調整薄膜之厚度,R1≦2.0μm,σ1≦0.5μm,RAV≦1.0μm,及σAV≦0.2μm, [式中,R1係一次之該測量厚度剖面中之薄膜厚度之最大值和最小值之差,表示該測量厚度剖面中之薄膜厚度之振幅,σ1係表示一次之該測量厚度剖面中之薄膜厚度之標準偏差,RAV係表示100次連續製作該測量厚度剖面而相加平均所取得之累計平均剖面中之薄膜厚度之最大值和最小值之差,表示該累計平均剖面中之薄膜厚度的振幅,σAV係表示該累計平均剖面中之薄膜厚度之標準偏差]。 A method for producing a film web comprising the following steps (A) to (C): (A) pressing from a mold having an adjustment means of a lip gap a thermoplastic resin, which is formed by filming while moving, and forming a film; (B) in the process of moving the film, the process of adjusting the thickness of the film, that is, repeating the following steps (a) to (c), The process of adjusting the thickness of the film, (a) measuring the thickness of the film in the transition at a specific interval in the width direction of the film orthogonal to the direction of travel of the film, and forming a step of individual thickness, (b) Or the individual thickness profile of the above, the step of measuring the thickness profile, (c) the step of adjusting the lip gap of the mold according to the measured thickness profile, and the set thickness profile; (C) rolling the film into a roll In the project (B), the thickness of the film is adjusted to satisfy the following conditions, R 1 ≦ 2.0 μm, σ 1 ≦ 0.5 μm, R AV ≦ 1.0 μm, and σ AV ≦ 0.2 μm. [wherein, R 1 is of the time-based measurement of the maximum cross-sectional thickness of the film thickness The difference between the minimum value, which represents the amplitude of the measured thickness profile of the film thickness, σ 1 represents the standard time-based measurement of the thickness profile of film thickness variations, R AV system 100 represents a consecutive fabrication of the cross-sectional thickness measurement and are added The difference between the maximum value and the minimum value of the film thickness in the cumulative average profile obtained is the amplitude of the film thickness in the cumulative average profile, and σ AV is the standard deviation of the film thickness in the cumulative average profile]. 如申請專利範圍第1項所記載之薄膜卷材之製造方法,其中在上述步驟(a)中,根據以特定間隔測量從上述薄膜之寬方向之一方之端部至另一方之端部,或從另一方之端部至一方之端部而所取得之與薄膜厚度有關的測量資料,製作一個上述個別厚度剖面。 The method for producing a film web according to claim 1, wherein in the step (a), the end portion from one end of the width direction of the film to the other end is measured at a specific interval, or One measurement of the individual thickness is made from the measurement data relating to the film thickness obtained from the other end to the end of one of the ends. 如申請專利範圍第1項所記載之薄膜卷材之製造方法,其中上述步驟(b)中,根據兩個以上之上述個別厚度剖面,製作上述測量厚度剖面。 The method for producing a film web according to claim 1, wherein in the step (b), the measured thickness profile is produced based on two or more individual thickness profiles. 如申請專利範圍第1~3項中之任一項所記載之薄膜卷材之製造方法,其中上述設定厚度剖面係從由期待厚度剖面及逆符號剖面所構成之群中被選擇出。 The method for producing a film web according to any one of claims 1 to 3, wherein the set thickness profile is selected from the group consisting of a desired thickness profile and a reverse sign profile. 如申請專利範圍第4項所記載之薄膜卷材之製造方法,其中上述設定厚度剖面為逆符號剖面。 The method for producing a film web according to the fourth aspect of the invention, wherein the set thickness profile is an inverse symbol cross section. 如申請專利範圍第5項所記載之薄膜卷材之製造方法,其中上述逆符號剖面係每製作上述測量厚度剖面,就根據該測量厚度剖面而被製作。 The method for producing a film web according to claim 5, wherein the inverse sign profile is produced based on the measured thickness profile for each of the measured thickness profiles.
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