TW201407172A - Test system - Google Patents

Abstract

A test system including a chamber, a client, and a server is disclosed. The chamber includes at least one object to be tested. The client includes a control device. The server includes a host device to control temperature of the chamber and provides setting information to the client according to pre-determined information. The control device determines the number of executing a testing program executed by the object according to the setting information.

Description

Test system

The present invention relates to a test system, and more particularly to a test system capable of performing aging tests on different kinds of test objects.

In general, any product must pass multiple test procedures before leaving the factory, and burn in is one of the product's test items. The aging test is performed by placing the product in a chamber to control the aging of the product by controlling the temperature change of the test chamber and as a subsequent aging analysis. However, the aging test is performed separately from other test items such as transmission rate test, signal strength test, and the like. It is usually necessary to wait until the aging test is completed before other test items are performed, or the aging test is performed after the completion of other test items.

Furthermore, the conventional test box can only be tested for a single product. If there are multiple products to be tested for aging, it is necessary to take turns to test. However, since the aging test time of each product is very long, the test time before leaving the factory is greatly increased. In addition, when the product is subjected to the aging test and the specified test of the product, the parameters must be set according to the planned aging test run and various specified test items, and the working time and cost of the control personnel are increased.

The invention provides a test system comprising a test box, a client and a server end. The test box is provided with at least one object to be tested. The client has a control device. The control device is coupled to receive the test object for causing the test object to execute a test program. The server end has a host device for controlling the test box The temperature, and according to a preset message, provides a setting information file to the client. The control device determines the number of times the test object executes the test program according to the set information file.

In order to make the features and advantages of the present invention more comprehensible, the preferred embodiments are described below, and are described in detail with reference to the accompanying drawings.

Figure 1 is a schematic illustration of a test system in accordance with an embodiment of the present invention. As shown, the test system 100 includes a test box 110, clients CI ₁ - CI ₆ and a server end SV. The server end SV passes through the test box 110 to perform an aging test on the object to be tested. In the present embodiment, the test box 110 has test stands FM ₁ ~ FM ₆ , but is not intended to limit the present invention. In other embodiments, test box 110 has other numbers of test stands.

Each of the test stands FM ₁ to FM _{6 in the} test box 110 has at least one object to be tested. The invention does not limit the number and type of objects to be tested for each test rack. In an embodiment, the number of objects to be tested of one of the test stands FM ₁ to FM ₆ may be the same or different from the number of objects to be tested of the other of the test stands FM ₁ to FM ₆ . In addition, in the present embodiment, the same test rack has the same kind of object to be tested, and different test racks have different kinds of objects to be tested. In other embodiments, the same test rack has different kinds of analytes.

In the present embodiment, the test system 100 has clients CI ₁ ~ CI ₆ , but is not intended to limit the invention. In other embodiments, test system 100 has at least one client. In this embodiment, the same type of object to be tested is placed on the same test rack. Thus, the client CI ₁ ~ CI ₆ are respectively coupled to a corresponding FM test stand ₁ ~ FM _6, for controlling the analyte test frame FM of ₁ ~ FM _6. In other embodiments, the same test rack may have different kinds of analytes. In this example, multiple clients will be coupled to the same test shelf, but different clients control different types of DUTs.

In this embodiment, the clients CI ₁ to CI ₆ each have a control device and a connection device. In a possible embodiment, the control device may be a computer, a controller, a control circuit, a processor, etc., but is not intended to limit the invention. Each control device controls the object to be tested on the corresponding test rack through the corresponding connecting device. Taking the client CI ₂ as an example, the client CI ₂ has a control device PC ₂ and a connection device CN ₂ . Control means controlling PC ₂ CN ₂ FM all analyte test stand ₂ via the connecting means.

In the present embodiment, the control device PC ₂ causes all the objects to be tested on the test stand FM ₂ to execute the same test program. In other embodiments, the control devices PC ₁ -PC ₆ can be coupled to the test stands FM ₁ -FM ₆ through the same connection device.

The embodiment of the present invention does not limit the test program executed by the object to be tested. In a possible embodiment, the test program executed by the test object of one of the test stands FM ₁ to FM ₆ may be the same or different from the test program executed by the test object of the other of the test stands FM ₁ to FM ₆ . In different test programs, the test items, time, and order are not the same.

The embodiment of the present invention does not limit the kind of the transmission interface between the connecting devices CN ₁ to CN ₆ and the object to be tested. In a possible embodiment, the connecting devices CN ₁ ~ CN ₆ transmit signals to the test frame FM ₁ ~ FM through a wired interface (such as RS-232, USB) or a wireless (such as infrared, blue) transmission interface. The object to be tested on ₆ . In other embodiments, one of the connection devices CN ₁ -CN ₆ is coupled to the transmission interface of the test object, and the other of the connection devices CN ₁ -CN ₆ is coupled to the transmission interface of the test object.

The server terminal SV has a host device HS. The host device HS controls the temperature of the test box 110 according to a preset message, and provides a setting information file S _SET to the clients CI ₁ to CI _{6 for the} preset message. It should be noted that, in this embodiment, the role of the preset message at the server end SV is to control the test box, and the setting information file S _SET at the client CI ₁ ~ CI ₆ is used to define the aging period and in each The number of executions of the test program during aging.

The invention does not limit the source of the preset message. In a possible embodiment, the preset message is planned by a planner and input to the host device HS. In addition, the present invention does not limit how the host device HS provides a setting information file S _SET to the clients CI ₁ -CI ₆ according to the preset message. In a possible embodiment, any information related to the power supply time of the host device HS can be used as the setting information file S _SET . In another possible embodiment, the host device HS directly provides the preset information as a setting information file S _SET to the control devices PC ₁ -PC ₆ .

In this embodiment, the host device HS determines whether to supply power to the object to be tested in the test box 110 according to the preset message. In a possible embodiment, the host device HS supplies power to all the objects to be tested in the test box 110 at the same time, or does not supply power to all the objects in the test box 110 at the same time. After the host device HS is powered, the clients CI ₁ ~ CI ₆ cause the test object to execute the corresponding test program. Therefore, in the present embodiment, an aging test and other items of tests can be performed simultaneously on the object to be tested.

The present invention does not limit the transmission interface between the server terminal SV and the clients CI ₁ to CI ₆ or the test box 110. In this embodiment, the host device HS transmits the setting information file S _SET to the clients CI ₁ -CI ₆ through the switching device 120 in the form of a cable, or receives the client CI from the switching device 120. ₁ ~ CI ₆ message. In a possible embodiment, the switching device 120 is an Ethernet switch, so the server terminal SV can communicate with the test box 110 and the switching device 120 via an Ethernet. In other embodiments, the switching device 120 can be a wireless access device, such as a wireless router or a wireless access point, so the transmission mode between the host device HS and the switching device 120 is wireless communication transmission, or the switching device 120 and the client The transmission mode between the terminals CI ₁ and CI ₆ is a wireless communication transmission, such as a wireless communication transmission technology according to the IEEE 802.11 or WI-FI wireless communication standard.

The control devices PC ₁ to PC ₆ determine the number of times the test program is executed corresponding to the object to be tested based on the set information file S _SET notified by the host device HS. For example, since the objects to be tested 131 and 133 are the same type of object to be tested, but different from the object to be tested 132, the control device PC ₂ determines that the objects to be tested 131 and 133 perform one according to the set information file S _SET . The number of times of the first test program, the control device PC ₆ determines the number of times the object to be tested 132 executes a second test program based on the set information file S _SET .

In this embodiment, although the test objects 131 and 132 execute different test programs, the number of times the test objects 131 and 132 execute the test program may be the same or different, depending on the length of time the test program executes a test run. . In other embodiments, the objects to be tested 131 and 133 are the same type of products, but the number of times the test objects 131 and 133 perform the test program are not necessarily the same because of the different performance of the internal components.

Figure 2A shows a possible embodiment of the preset message received by the server. The host device HS sets the temperature of the test box 110 according to the preset message 200, and supplies or does not supply power to the object to be tested. In a possible embodiment, the preset message 200 is provided to the host device HS by a planner. In this embodiment, the preset message 200 includes parameter information groups 0-7, but is not used. Limit the invention. In other embodiments, the number of parameter information groups may be greater or less than eight.

In this embodiment, each parameter information group includes a power supply state parameter P(n), a temperature parameter T(n), a waiting time parameter WT(n), and a maintenance time parameter MT(n), where 0≦ n≦7. In this embodiment, the power supply state parameter P(n) includes first and second states, the first state is a power supply state, and the second state is a power supply stop state. For example, since the power supply state parameter P(0) in the parameter information group 0 is the first state, the host device HS supplies power to the object to be tested, and controls the temperature of the test box 110 according to the temperature parameter T(0). At 25 ° C. The host device HS waits for 60 minutes according to the waiting time parameter WT(0), and maintains the temperature of the test box 110 at 25 ° C according to the maintenance time parameter MT(0) for 120 minutes.

In other embodiments, when the host apparatus according to parameter information set HS 0 test chamber temperature control, the control device PC ₁ ~ PC ₆ so that the analyte test programs corresponding to the execution, for capturing analyte test program execution The travel time required. In another embodiment, the travel time required for the test object to execute the test program is preset in advance, and the host device HS informs the control of the travel time required for the test object to execute the test program by setting the information file S _SET . Device PC ₁ ~ PC ₆ . In other embodiments, before the setting information file S _SET is obtained, the control device PC ₁ -PC ₆ first executes the test object according to the test program to execute at least one test stroke, and counts the execution time of the test stroke for obtaining Know the travel time required for the test object to execute the test program.

In addition, please refer to FIG. 2A, the power supply state parameter P(1) in the parameter information group 1 is the second state, therefore, the host device HS stops supplying power to the object to be tested, and the test box is made according to the temperature parameter T(1). 110 temperature is 25 ° C Change to -40 ° C. When the temperature of the test box 110 starts to change, the host device HS waits for 40 minutes according to the waiting time parameter WT(1), and after 40 minutes, maintains the temperature of the test box 110 at - according to the maintenance time parameter MT(1). 40 ° C, and maintained for 30 minutes.

In a possible embodiment, when the temperature of the test box 110 reaches too fast or too slow to reach -40 ° C, it indicates that the test box 110 is unstable, and therefore, the host device HS will issue a warning message to remind the tester. For example, when the host device HS controls the temperature of the test box 110 to change from 25 ° C to -40 ° C according to the temperature parameter T (1), the host device HS will wait for 40 minutes, and after 40 minutes, determine the test box 110 Whether the temperature has reached -40 ° C. If the temperature of the test box 110 is not equal to the preset temperature, indicating that the test box 110 is abnormal, the host device HS sends a warning message to remind the tester and sends an interrupt message to the control device PC ₁ ~ PC ₆ for making All the objects to be tested stop executing the corresponding test program, and the host device HS immediately stops supplying power to all the objects to be tested. In another possible embodiment, when the host device HS controls the temperature of the test box 110 to change from 25 ° C to -40 ° C, if the test box temperature exceeds a predetermined temperature within a predetermined time, the test box 110 is determined. An abnormality occurs, such as an explosion event. The host device HS sends a warning message to remind the tester and sends an interrupt message to the control devices PC ₁ ~ PC ₆ to stop all the test objects from executing the corresponding test program. And immediately stop supplying power to all the objects to be tested, wherein the predetermined time is obtained by multiplying the waiting time parameter WT(1) by a predetermined percentage (for example, 10%); and the preset temperature is determined by the temperature parameter T(1) It is obtained by multiplying by a preset value (for example, 5). It should be noted that the preset value can be appropriately adjusted according to the allowable temperature in the test box. In another embodiment, the temperature of the test box is as long as the temperature of the test box 110 reaches -40 ° C, the host device HS no longer waits, and immediately maintains the temperature of the test box 110.

In the present embodiment, by the preset message 200 shown in FIG. 2A, the duration of each aging period can be inferred. For example, when the host device HS receives the parameter information group 0, it supplies power to the object to be tested and maintains for 120 minutes. Since the host device HS does not supply power to the object to be tested when the parameter information group 1 is received, the length of the first aging period is 120 minutes.

Similarly, please refer to parameter information groups 2 and 3. Since the total maintenance time of the host device HS to the object to be tested is MT(2)+MT(3)=290 minutes, the length of the second aging period is 290. minute. In the parameter information groups 5 and 6, since the total maintenance time of the host device HS to the object to be tested is MT (5) + MT (6) = 425 minutes, the duration of the third aging period is 425 minutes. In another embodiment, the host device HS estimates that the duration of each aging period is performed by the control devices PC ₁ -PC ₆ , so that the host device HS of the server SV sets the preset message 200 as the set information file S. _{The SET} (the preset message 200 is equivalent to the setting information file S _SET ) is transmitted to the clients CI ₁ to CI ₆ , and the control devices PC ₁ to PC ₆ can obtain the duration of each aging period. For the specific implementation, please refer to FIG. 3 and Description.

In the above embodiment, the waiting time is not included in the aging period. However, in other embodiments, the aging period further includes latency. For example, the duration of the first aging period is WT(0) + MT(0) = 180 minutes. The duration during the second aging period is MT(2) + WT(3) + MT(3) = 350 minutes. The duration during the third aging period is MT(5) + WT(6) + MT(6) = 525 minutes.

The host device HS generates a setting information file S _SET to the control units PC ₁ to PC ₆ according to the preset message 200 for informing the power supply time so that the control units PC ₁ to PC ₆ determine the number of times the test object performs the test time.

Figure 2B is a possible embodiment of setting the information file S _SET . In this embodiment, the role of the setting information file S _SET at the clients CI ₁ ~ CI ₆ is used to define the length of the aging period and the number of times the test object executes the test program. In this embodiment, the control devices PC ₁ -PC ₆ can derive the temperature curve 210 according to the set information file S _SET notified by the host device HS, and then from the temperature curve 210, the aging period CT ₁ ~ CT ₃ can be known. The duration, that is, the time when the host device HS is powered.

The control devices PC ₁ to PC ₆ determine the number of times the corresponding test program is executed corresponding to the object to be tested based on the duration of the CT ₁ to CT ₃ during the aging period. For example, assume that the travel time required for the test object 131 to execute the test program is TP ₁₃₁ . During the aging control apparatus PC ₂ CT divided by the duration of the test was ₁ 131 TP ₁₃₁ travel time, the aging period that can be _1, the analyte test program 131 may perform a CT.

Since the duration of CT ₂ during aging is greater than the duration of CT ₁ during aging, in CT ₂ during aging, the number of times the test object 131 executes the test program (4 times) is greater than that during the aging period CT ₁ 131 The number of times the test program was executed (1 time). The number of tests for other analytes is analogous.

The present invention does not limit the number of times each test object executes a test program. In a possible embodiment, different test programs (eg, 1 time, 4 times, 6 times) are executed in different aging periods (CT ₁ ~ CT ₃ ) for the same object to be tested (such as 131). . In another possible embodiment, for different kinds of analytes (such as 131, 132), different number of test programs (4 times, 2 times) are executed during the same aging period (CT ₂ ). In other embodiments, for the same type of test object (eg, 131, 133), different number of test programs (4 times, 3 times) are performed during the same aging period (CT ₂ ).

Since the test system 100 has a plurality of clients, the aging test can be performed automatically and simultaneously on a plurality of different types of products without requiring the tester to reset. In addition, while performing the aging test, other test items can be tested together to achieve multiple tests per unit time, shorten the test time required for the test object, and provide a simple travel planning method.

Figure 3 is a schematic diagram of a possible operation of the client of the present invention. Please cooperate with the first picture of this case. Since the operating principles of the client CI ₁ ~ CI ₆ are the same, the following takes the client CI ₂ as an example. As shown in Fig. 3, first, a setting information file S _{SET is} received (step S310). The present invention does not limit the manner in which the setting information file S _SET is received. For example, the client CI ₁ ~ CI ₆ can receive the setting information file S _SET by wired or wireless means. The present invention also does not limit the content of the setting information file S _SET . As long as the client CI ₁ ~ CI _{6 can} know the information of the power supply time of the host device HS, it can be used as the setting information file S _SET .

In another possible embodiment, before receiving the setting information file S _SET , the client CI ₂ first determines whether a boot-up message is received. If not, then continue to determine whether to receive the boot message until the boot message is received. In a possible embodiment, the boot message is provided by the object to be tested 131, and the client receives the set information file S _SET according to the boot message. In addition, the client CI ₁ can also retrieve the travel time TP _{131 of the} test program 131 after the boot message is executed. In other embodiments, the travel time of the object 131 is also included in the set information file S _SET .

The number of times the test object 131 executes the test program is calculated (step S320). In a possible embodiment, the client CI ₂ can know the time when the host device HS is powered according to the set information file S _SET , that is, the duration of the CT ₁ ~ CT ₃ during the aging period.

In this embodiment, the number of times the test object 131 executes the test program during the aging period CT ₁ to CT ₃ can be determined according to the duration of the aging period CT ₁ to CT ₃ and the travel time TP ₁₃₁ of the object 131. . In a possible embodiment, by dividing the duration of the aging period CT ₁ by the travel time TP ₁₃₁ , the number of executions of the object 131 during the aging period CT ₁ can be known. In other embodiments, other calculation formulas may be utilized to calculate the duration of CT ₁ and the travel time TP ₁₃₁ .

The test program is executed in accordance with the set stroke schedule (step S330). In a possible embodiment, the control device PC _{2 of the} client CI ₂ has a test software. According to the set information file S _SET , the parameters of the test software can be set to plan the test run of the test object 131. Therefore, when After the control device PC ₂ executes the test software, the test object 131 can execute the test program.

In this embodiment, while the object to be tested 131 executes the test program, the object to be tested 131 also undergoes an aging test. Therefore, the test time is greatly reduced. Furthermore, when the test object 131 is tested, another type of test object (132) is also tested at the same time. Therefore, the tester does not need to wait for the test object 131 to complete the test before starting the test object 132. test.

Figure 4 is a possible implementation of step S320. First, the coefficients n, i, and CT _{i are} initialized (step S410). In this embodiment, after initialization, n=0, i=1, CT _i =0.

It is judged whether or not the power supply state parameter P(n) is a first state (step S420). As shown in FIG. 2A, the power supply state parameter P(0) is in the first state, that is, the power supply state, and therefore, step S421 is performed. In step S421, CT ₁ = CT _i + MT(0) = 0 + 120 = 120. Next, it is judged whether or not the power supply state parameter P(1) is a first state (step S430).

As shown in FIG. 2A, the power supply state parameter P (1) to a second state, i.e., not the power supply state, thus performing step S440, the calculation of the analyte CT _1, the test program executed N _i times during the aging. In this embodiment, step S440 is to divide the aging period CT ₁ by the time TP at which the test object executes the test program to obtain a first calculation result N ₁ .

Next, it is judged whether or not the power supply state parameter P(1) is a null value (step S450). As can be seen from Fig. 2A, the power supply state parameter P(1) is not a null value. Therefore, step S452 is executed, the coefficient i is set to 2, and step S423 is executed, the coefficient n is set to 1, and the process returns to step S420.

Step S420 determines whether the power supply state parameter P(1) is the first state. As can be seen from FIG. 2A, the power supply state parameter P(1) is in a second state (ie, no power supply state). Therefore, step S422 is executed to determine whether the power supply state parameter P(2) is a null value. As can be seen from Fig. 2A, the power supply state parameter P(2) is not a null value. Therefore, step S423 is executed, n is set to 2, and the process returns to step S420.

In step S420, it is determined whether the power supply state parameter P(2) is the first state. As can be seen from Fig. 2A, the power supply state parameter P(2) is in the first state. Therefore, step S421 is executed, and CT ₂ = CT _i + MT(2) = 0 + 90 = 90. Next, it is judged whether or not the power supply state parameter P(3) is the first state (step S430). As can be seen from Fig. 2A, the power supply state parameter P(3) is in the first state. Therefore, step S423 is executed, the coefficient n is set to 3, and step S420 is executed.

In step S420, it is determined whether the power supply state parameter P(3) is the first state. It can be seen from Fig. 2A that the power supply state parameter P(3) is in the first state. Therefore, step S421 is executed, and the previously calculated CT _{2 is} further added with the parameter MT(3) to obtain a new aging period CT _{2 .} . Therefore new CT ₂ = previous CT ₂ + MT(3) = 90 + 200 = 290.

Next, it is judged whether or not the power supply state parameter P(4) is the first state (step S430). Be seen from Figure 2A, the power supply state parameter P (4) to a second state (i.e., no power supply state), therefore, perform step S440, the CT ₂ during the aging was measured by the time execution of the test program TP, for A second calculation result N _{2 is obtained} . Next, it is judged whether or not the power supply state parameter P(4) is a null value (step S450). As can be seen from Fig. 2A, the parameter P(4) is not a null value. Therefore, step S452 is executed, the coefficient i is set to 3, and the n coefficient is set to 4 (step S423), and then step S420 is executed.

Step S420 determines whether the power supply state parameter P(4) is the first state. As can be seen from FIG. 2A, the power supply state parameter P(4) is in a second state (ie, no power supply state). Therefore, step S422 is executed to determine whether the power supply state parameter P(5) is a null value (step S422). As can be seen from FIG. 2A, the power supply state parameter P(5) is not a null value. Therefore, step S423 is executed, the coefficient n is set to 5, and step S420 is executed.

In step S420, it is determined whether the power supply state parameter P(5) is the first state. Be seen from Figure 2A, the power supply state parameter P (5) to a first state, step _{S421, CT 3 = CT i +} MT (5) = 0 + 150 = 150. Next, it is judged whether or not the power supply state parameter P(6) is the first state. As can be seen from FIG. 2A, since the power supply state parameter P(6) is in the first state, step S423 is executed, the coefficient n is set to 6, and step S420 is executed.

In step S420, it is determined whether the power supply state parameter P(6) is the first state. It is seen from Figure 2A, the power supply state parameter P (6) to a first state, step S421, previously calculated parameters plus CT ₃ MT (6), will be determined during the aging new CT ₃ . In this embodiment, the new CT ₃ = previous CT ₃ + MT6 = 150 + 275 = 425.

Next, it is judged whether or not the power supply state parameter P(7) is the first state (step S430). It can be seen from FIG. 2A that the power supply state parameter P(7) is a second state (ie, no power supply state). Therefore, step S440 is performed to divide the aging period CT ₃ by the time TP at which the test object executes the test program. A third calculation result N _{3 is obtained} . Next, it is judged whether or not the power supply state parameter P(7) is a null value (step S450). As can be seen from FIG. 2A, the power supply state parameter P(7) is not a null value. Therefore, step S452 is executed to set the coefficient i to 4, then step S423 is executed, n is set to 7, and step S420 is executed.

In step S420, it is determined whether the power supply state parameter P(7) is the first state. As can be seen from Fig. 2A, the power supply state parameter P(7) is in the second state. Therefore, step S422 is executed to determine whether the power supply state parameter P(8) is a null value. Since FIG. 2A does not have the power supply state parameter P(8), it is determined that the power supply state parameter P(8) is null, and step S451 is executed to end the calculation of the number of tests.

In summary, since the invention can simultaneously perform aging test and various specified test items on different types of products at the same time, the test time before leaving the factory can be greatly reduced. In addition, when the product is subjected to the aging test and the specified test, the parameter setting can be performed only according to the planned aging test run, and the test times of various specified test items are not required to be parameterized, thereby reducing the working time of the control personnel. And cost.

Unless otherwise defined, all terms (including technical and scientific terms) are used in the ordinary meaning Moreover, unless expressly stated, the definition of a vocabulary in a general dictionary should be interpreted as consistent with the meaning of an article in its related art, and should not be interpreted as an ideal state or an overly formal voice.

Although the present invention has been disclosed in the above preferred embodiments, it is not intended to limit the invention, and any one of ordinary skill in the art can make some modifications and refinements without departing from the spirit and scope of the invention. Therefore, the scope of the invention is defined by the scope of the appended claims.

100‧‧‧Test system

110‧‧‧Test box

131~133‧‧‧Test object

120‧‧‧Switching device

200‧‧‧Default message

210‧‧‧temperature curve

CI ₁ ~CI ₆ ‧‧‧Client

SV‧‧‧server side

FM ₁ ~ FM ₆ ‧‧‧ test stand

PC ₁ ~ PC ₆ ‧‧‧ control device

CN ₁ ~CN ₆ ‧‧‧Connecting device

HS‧‧‧ host device

S _SET ‧‧‧Set information file

S0~S7‧‧

CT ₁ , CT ₂ ‧ ‧ aging period

TP ₁₃₁ ~TP ₁₃₃ ‧‧‧Travel time

S310~S330‧‧‧Steps

Figure 1 is a schematic illustration of a test system of the present invention.

Figure 2A is a possible embodiment of the preset message of the present invention.

Figure 2B is a possible embodiment of one of the set information files of the present invention.

Figure 3 is a schematic diagram of a possible operation of the client of the present invention.

Figure 4 is a possible embodiment of step S320.

100‧‧‧Test system

110‧‧‧Test box

131~133‧‧‧Test object

120‧‧‧Switching device

CI ₁ ~CI ₆ ‧‧‧Client

SV‧‧‧server side

FM ₁ ~ FM ₆ ‧‧‧ test stand

PC ₁ ~ PC ₆ ‧‧‧ control device

CN ₁ ~CN ₆ ‧‧‧Connecting device

HS‧‧‧ host device

S _SET ‧‧‧Set information file

Claims (10)

A test system includes: a test box, at least one object to be tested; a client having a control device coupled to the object to be tested for causing the test object to execute a test program; and a server end Having a host device for controlling the temperature of the test box, and providing a setting information file to the client according to a preset message; wherein the control device determines that the object to be tested performs the test according to the setting information file The number of times the program. The test system of claim 1, wherein the host device determines a duration of an aging period according to the preset message, and supplies power to the object to be tested through the test box during the aging period. The test system of claim 2, wherein the setting information file comprises a first parameter information group, a second parameter information group, and a third parameter information group; the control device determines the first parameter information group Whether the first power supply state parameter is a preset state, and when the first power supply state parameter is the preset state, the control device retrieves one of the first maintenance time parameters in the first parameter information group, and determines Whether the second power supply state parameter of the second parameter information group is the preset state. The test system of claim 3, wherein the control device uses the first maintenance time parameter as the duration of the aging period when the second power supply state parameter is not the preset state. The test system of claim 3, wherein when the first power supply state parameter is the preset state, the control device further retrieves one of the first parameter time groups in the first parameter information group, when the Second power supply The state parameter is not the preset state, and the control device uses the sum of the first maintenance time parameter and the first waiting time parameter as the duration of the aging period. The test system of claim 3, wherein when the second power supply state parameter is the preset state, the control device captures a second maintenance time parameter of the second parameter information group, and determines Whether the third power supply state parameter of the third parameter information group is the preset state. The test system of claim 6, wherein when the third power supply state parameter is not the preset state, the control device cooperates with the total of the first and second maintenance time parameters for the aging period. duration. The test system of claim 7, wherein when the first power supply state parameter is the preset state, the control device further retrieves one of the first parameter time groups in the first parameter information group, when the The second power supply state parameter is the preset state, and the control device further captures a second waiting time parameter of the second parameter information group, and when the third power supply state parameter is not the preset state, the control device The sum of the first maintenance time parameter, the first waiting time parameter, the second maintenance time parameter, and the second waiting time parameter is taken as the duration of the aging period. The test system of claim 2, wherein the control device knows a test time required for the test object to execute the test program according to the set information file, and divides the duration of the aging period by The test time is used to determine the number of times the test object executes the test program. The test system of claim 2, wherein the control device causes the test object to execute the test program during a start-up period, and Taking a test time required for the test object to execute the test program, and dividing the duration of the aging period by the test time, determining the number of times the test object executes the test program during the aging period.