TW201405880A - Substrate for optical semiconductor device and method for manufacturing the same, and optical semiconductor device - Google Patents

Substrate for optical semiconductor device and method for manufacturing the same, and optical semiconductor device Download PDF

Info

Publication number
TW201405880A
TW201405880A TW102112185A TW102112185A TW201405880A TW 201405880 A TW201405880 A TW 201405880A TW 102112185 A TW102112185 A TW 102112185A TW 102112185 A TW102112185 A TW 102112185A TW 201405880 A TW201405880 A TW 201405880A
Authority
TW
Taiwan
Prior art keywords
optical semiconductor
semiconductor device
substrate
resin layer
layer
Prior art date
Application number
TW102112185A
Other languages
Chinese (zh)
Other versions
TWI535068B (en
Inventor
Wataru Goto
Hiroyuki Fukasawa
Original Assignee
Shinetsu Chemical Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shinetsu Chemical Co filed Critical Shinetsu Chemical Co
Publication of TW201405880A publication Critical patent/TW201405880A/en
Application granted granted Critical
Publication of TWI535068B publication Critical patent/TWI535068B/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/48Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/48Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
    • H01L33/58Optical field-shaping elements
    • H01L33/60Reflective elements
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/44Structure, shape, material or disposition of the wire connectors prior to the connecting process
    • H01L2224/45Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
    • H01L2224/45001Core members of the connector
    • H01L2224/45099Material
    • H01L2224/451Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
    • H01L2224/45138Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
    • H01L2224/45144Gold (Au) as principal constituent
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Power Engineering (AREA)
  • Led Device Packages (AREA)
  • Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)

Abstract

The invention relates to a substrate for optical semiconductor device. The substrate comprises at least two electric connection portions electrically connected with the optical semiconductor device and is characterized in that the substrate comprises a basic table formed by immersing silicone resin composition in fiber reinforced material and solidifying the same on the surface a resin layer connected with a metallic layer, that an element carrying recess portion is formed on the resin layer of the basic table, that the element carrying recess portion is used for containing and carrying the optical semiconductor device and at least passes through the resin layer in thickness direction, and that a coating layer is formed on the inner surface of the element carrying recess portion. The invention provides a substrate for optical semiconductor device and a method for manufacturing the same. The substrate for optical semiconductor device is used for achieving a substrate for optical semiconductor device with high mechanical stability, high durability, and high heat dissipation. The invention also provides an optical semiconductor device using the substrate.

Description

光學半導體裝置用基板及其製造方法及光學半導體裝置 Substrate for optical semiconductor device, method of manufacturing the same, and optical semiconductor device

本發明係關於光學半導體裝置用基板及其製造方法、使用有該基板之光學半導體裝置。 The present invention relates to a substrate for an optical semiconductor device, a method of manufacturing the same, and an optical semiconductor device using the substrate.

LED、光二極體等之光學元件係高效率,且對於外部應力及環境的影響之耐性高,因此於產業界中廣泛使用。進而,光學元件係除效率高以外,壽命亦長,且小型化(compact),可構成為多數不同的結構,並可以較低的製造成本製造(例如,參照專利文獻1)。 Optical elements such as LEDs and photodiodes are widely used in the industry because of their high efficiency and high resistance to external stress and environmental influences. Further, the optical element has a long life and a compact size, and can be configured to have a large number of different configurations and can be manufactured at a low manufacturing cost (for example, refer to Patent Document 1).

例如,一般而言,搭載半導體元件的基板之材質方面,使用具有以FR-4為代表的纖維強化材之環氧基材乃大眾知悉。 For example, in general, an epoxy substrate having a fiber reinforced material typified by FR-4 is known from the viewpoint of the material of the substrate on which the semiconductor element is mounted.

尤其,於產生大量的熱之高輸出的光學半導體裝置中,使用在高散熱性的同時,長時間保持高反射率的基板一事係為重要。 In particular, in an optical semiconductor device that generates a large amount of heat and high output, it is important to use a substrate having a high reflectance for a long period of time while maintaining high heat dissipation.

[先前技術文獻] [Previous Technical Literature] [專利文獻] [Patent Literature]

[專利文獻1]日本特表2011-521481號公報 [Patent Document 1] Japanese Patent Publication No. 2011-521481

本發明係為了解決上述課題而完成者,其目的為提供一種機械安定性高,且用以實現高耐久性、高散熱性的光學半導體裝置之光學半導體裝置用基板與其之製造方法,以及使用有該基板之光學半導體裝置。 The present invention has been made to solve the above problems, and an object of the present invention is to provide a substrate for an optical semiconductor device having high mechanical stability and high optical durability and high heat dissipation, and a method for manufacturing the same, and a method for manufacturing the same. An optical semiconductor device of the substrate.

為了達成上述目的,若依據本發明,則可提供一種具有至少2個與光學半導體元件電連接之電連接部之光學半導體裝置用基板,其特徵為,具有使聚矽氧樹脂組成物含浸於纖維強化材且經硬化的樹脂層表面具有接合有金屬層的基台,於該基台之前述樹脂層側形成有用以收容、搭載前述光學半導體元件之至少在厚度方向貫穿前述樹脂層的元件搭載用凹部,且於該元件搭載用凹部的內面形成有鍍敷層者。 In order to achieve the above object, according to the present invention, there is provided a substrate for an optical semiconductor device having at least two electrical connection portions electrically connected to an optical semiconductor element, characterized in that the polyfluorene resin composition is impregnated into the fiber. The surface of the resin layer on which the hardened material is hardened has a metal layer, and the resin layer is formed on the resin layer side of the base to form an element for mounting the optical semiconductor element in the thickness direction. The recessed portion is formed with a plating layer on the inner surface of the element mounting recess.

只要是如上所述者,則成為機械安定性高,且具有高耐久性、高散熱性之光學半導體裝置用基板。 As described above, the substrate for an optical semiconductor device having high mechanical stability and high durability and high heat dissipation properties is obtained.

此時,前述電連接部,較佳為藉由鍍敷而形成於電連接部用凹部的內面,且與前述金屬層電連接者, 該電連接部用凹部係形成於前述基台之前述樹脂層側且至少在厚度方向貫穿前述樹脂層。 In this case, the electrical connection portion is preferably formed on the inner surface of the recess portion for the electrical connection portion by plating, and is electrically connected to the metal layer. The electrical connection portion recessed portion is formed on the resin layer side of the base and penetrates the resin layer at least in the thickness direction.

只要是如上述所述者,則成為散熱性優異者。此外,成為藉由金屬層而能夠與其他基板連接者。 As long as it is as described above, it is excellent in heat dissipation. Further, it can be connected to another substrate by a metal layer.

又,於此情況中,前述纖維強化材係以玻璃纖維為佳。 Moreover, in this case, it is preferable that the said fiber reinforcement material is glass fiber.

只要纖維強化材為玻璃纖維,則進一步成為展現良好的耐紫外線性及耐熱性的基板,且亦可確保纖維強化材與聚矽氧樹脂組成物之良好的接著。進而,玻璃纖維由於為低價且容易處理的材料,因此就成本的觀點而言亦為有利。 When the fiber reinforced material is a glass fiber, the substrate exhibits excellent ultraviolet resistance and heat resistance, and a good adhesion between the fiber reinforced material and the polyoxymethylene resin composition can be ensured. Further, since the glass fiber is a material which is inexpensive and easy to handle, it is also advantageous from the viewpoint of cost.

又,於此情況中,前述基台之樹脂層,係以使用至少1層以上使前述聚矽氧樹脂樹脂組成物含浸於前述纖維強化材之預浸體並使其硬化者為佳。 Moreover, in this case, it is preferable that the resin layer of the base is used by impregnating the prepreg of the fiber reinforced material with at least one layer or more and hardening the polyoxyn resin resin composition.

只要是如上述所述者,則成為具有所期望的厚度且機械安定性更為優異者。 As long as it is as described above, it has a desired thickness and is more excellent in mechanical stability.

又,於此情況中,前述聚矽氧樹脂組成物係可為縮合硬化型或加成硬化型之聚矽氧樹脂組成物。 Moreover, in this case, the polyoxyphthalocene resin composition may be a condensation hardening type or an addition hardening type polyoxymethylene resin composition.

只要是如上所述者,則成為機械特性、耐熱性、耐變色性優異,且表面之黏性少的光學半導體裝置用基板。 When it is as described above, it is a substrate for an optical semiconductor device which is excellent in mechanical properties, heat resistance, and discoloration resistance and has little surface stickiness.

又,於此情況中,可為於前述基台上具有熱硬化性樹脂之反射鏡結構或密封材堤壩結構者。 Further, in this case, it may be a mirror structure having a thermosetting resin or a seal material dam structure on the base.

如此一來,只要是具有反射鏡結構者則成為高光束者,只要是具有密封材堤壩結構者則成為可維持密封材的 形狀之高品質者。 In this case, as long as it has a mirror structure, it becomes a high beam, and if it has a seal dam structure, it can maintain a sealing material. The high quality of the shape.

此外,若依據本發明,則可提供一種於本發明之光學半導體裝置用基板上搭載有光學半導體元件的光學半導體裝置。 Further, according to the present invention, an optical semiconductor device in which an optical semiconductor element is mounted on a substrate for an optical semiconductor device of the present invention can be provided.

只要是如上所述者,則成為機械安定性高,且高耐久性、高散熱性者。 As long as it is as described above, it has high mechanical stability, high durability, and high heat dissipation.

此外,若依據本發明,則可提供一種光學半 導體裝置用基板之製造方法,其係製造具有至少2個與光學半導體元件電連接之電連接部之光學半導體裝置用基板的方法,其特徵為包含:使聚矽氧樹脂組成物含浸於纖維強化材,經硬化的樹脂層表面接合有金屬層的基台之前述樹脂層側,形成有用以收容、搭載前述光學半導體元件之至少在厚度方向貫穿前述樹脂層的元件搭載用凹部之步驟、與於前述元件搭載用凹部的內面形成鍍敷層之步驟。 Furthermore, according to the invention, an optical half can be provided A method for producing a substrate for a conductor device, which is a method for producing a substrate for an optical semiconductor device having at least two electrical connection portions electrically connected to an optical semiconductor element, comprising: impregnating a polyfluorene oxide resin composition with fiber reinforcement a step of forming a component mounting recessed portion that penetrates the resin layer in at least a thickness direction of the optical semiconductor element in the thickness direction of the resin layer on the surface of the hardened resin layer The step of forming a plating layer on the inner surface of the element mounting recess.

只要是如上所述者,則可製造機械安定性高,且具有高耐久性、高散熱性之光學半導體裝置用基板。 As described above, it is possible to manufacture a substrate for an optical semiconductor device having high mechanical stability and high durability and high heat dissipation.

於此情況中,於形成用以收容、搭載前述光學半導體元件的元件搭載用凹部之步驟中,可於將前述金屬層接合於前述樹脂層的表面之後的前述基台形成前述元件搭載用凹部。 In this case, in the step of forming the element mounting recessed portion for accommodating and mounting the optical semiconductor element, the element mounting recessed portion may be formed on the base after the metal layer is bonded to the surface of the resin layer.

只要是依據上述的方式,則可容易形成具有所期望的深度之元件搭載用凹部。 According to the above aspect, the element mounting recess having a desired depth can be easily formed.

或者,於形成用以收容、搭載前述光學半導 體元件的元件搭載用凹部之步驟中,可於接合前述金屬層之前的前述樹脂層形成與前述元件搭載用凹部相對應的貫通孔,其後,將前述樹脂層與前述金屬層進行接合。 Or formed to receive and mount the aforementioned optical semiconductor In the step of the element mounting recessed portion of the body element, a through hole corresponding to the element mounting recessed portion may be formed in the resin layer before the metal layer is joined, and then the resin layer and the metal layer may be bonded to each other.

只要是依據上述的方式,則可減低形成元件搭載用凹部的步驟之步驟時間。 According to the above aspect, the step of the step of forming the recess for mounting the component can be reduced.

又,於此情況中,較佳為具有:於前述基台的前述樹脂層側形成至少在厚度方向貫穿前述樹脂層的電連接部用凹部,於該電連接部用凹部的內面藉由鍍敷形成與前述金屬層電連接的前述電連接部之步驟。 Moreover, in this case, it is preferable that the recessed portion for the electrical connection portion that penetrates the resin layer at least in the thickness direction is formed on the resin layer side of the base, and the inner surface of the recess portion for the electrical connection portion is plated. The step of forming the aforementioned electrical connection portion electrically connected to the aforementioned metal layer is applied.

只要是依據上述方式,則可製造散熱性優異的光學半導體裝置用基板。於此所製造出的光學半導體裝置用基板中,係可藉由金屬層而與其他的基板連接。 According to the above aspect, it is possible to manufacture a substrate for an optical semiconductor device having excellent heat dissipation properties. The substrate for an optical semiconductor device manufactured as described above can be connected to another substrate by a metal layer.

又,於此情況中,可具有於前述基台上形成熱硬化性樹脂之反射鏡結構或密封材堤壩結構的步驟。 Further, in this case, there may be a step of forming a mirror structure or a seal material dam structure of a thermosetting resin on the base.

只要是依據如此之製造方法,則形成反射鏡結構而可製造高光束的光學半導體裝置用基板,或者形成密封材堤壩結構而可製造可維持密封材的形狀之高品質的光學半導體裝置用基板。 According to such a manufacturing method, a substrate for an optical semiconductor device having a high beam of light can be produced by forming a mirror structure, or a sealing material dam structure can be formed, and a high-quality substrate for an optical semiconductor device capable of maintaining the shape of the sealing material can be manufactured.

本發明之光學半導體裝置用基板,係於使聚矽氧樹脂組成物含浸於纖維強化材而經硬化的樹脂層表面接合有金屬層的基台之樹脂層側,形成用以收容、搭載光學半導體元件之至少在厚度方向貫穿樹脂層的元件搭載用 凹部,且於元件搭載用凹部的內面形成鍍敷層所製造者,因此其係機械安定性高,且具有高耐久性、高散熱性的光學半導體裝置用基板。 The substrate for an optical semiconductor device of the present invention is formed by immersing a polyoxyxylene resin composition on a resin layer side of a base on which a metal layer is bonded to a surface of a resin layer which is cured by a fiber-reinforced material, and is formed to accommodate and mount an optical semiconductor. Element mounting of the element that penetrates the resin layer at least in the thickness direction Since the recessed portion is formed by forming a plating layer on the inner surface of the element mounting recessed portion, it is a substrate for an optical semiconductor device having high mechanical stability and high durability and high heat dissipation.

1‧‧‧基台 1‧‧‧Abutment

1a‧‧‧樹脂層 1a‧‧‧ resin layer

1b‧‧‧金屬層 1b‧‧‧ metal layer

2‧‧‧纖維強化材 2‧‧‧Fiber-reinforced materials

2’、2”‧‧‧纖維 2', 2" ‧ ‧ fiber

3‧‧‧電連接部 3‧‧‧Electrical connection

4‧‧‧元件搭載用凹部 4‧‧‧Component mounting recess

5‧‧‧鍍敷層 5‧‧‧ plating layer

6‧‧‧電連接部用凹部 6‧‧‧ recess for electrical connection

7‧‧‧反射鏡結構 7‧‧‧Mirror structure

8‧‧‧密封材堤壩結構 8‧‧‧ Sealing material dam structure

9‧‧‧阻劑 9‧‧‧Resist

10、20、30‧‧‧光學半導體裝置用基板 10, 20, 30‧‧‧ substrates for optical semiconductor devices

11、21、31‧‧‧光學半導體裝置 11, 21, 31‧‧‧ Optical semiconductor devices

12‧‧‧光學半導體元件 12‧‧‧Optical semiconductor components

13‧‧‧金屬箔 13‧‧‧metal foil

[第1圖]係顯示本發明之光學半導體裝置用基板之一例的概略圖。(A)概略俯視圖。(B)概略剖面圖。 [Fig. 1] is a schematic view showing an example of a substrate for an optical semiconductor device of the present invention. (A) A schematic plan view. (B) A schematic cross-sectional view.

[第2圖]係顯示樹脂層內之纖維強化材的纖維層之纖維方向的概略俯視圖。 [Fig. 2] is a schematic plan view showing the fiber direction of the fiber layer of the fiber-reinforced material in the resin layer.

[第3圖]係為本發明之大面積印刷基板的形態之光學半導體裝置用基板的概略俯視圖。 [Fig. 3] is a schematic plan view of a substrate for an optical semiconductor device in the form of a large-area printed circuit board of the present invention.

[第4圖]係說明本發明之光學半導體裝置的製造方法之一例的說明圖。 [Fig. 4] is an explanatory view illustrating an example of a method of manufacturing the optical semiconductor device of the present invention.

[第5圖]係顯示以本發明之光學半導體裝置的製造方法所製造的本發明之光學半導體裝置用基板之例的概略剖面圖。 [Fig. 5] is a schematic cross-sectional view showing an example of a substrate for an optical semiconductor device of the present invention produced by the method for producing an optical semiconductor device of the present invention.

[第6圖]係顯示具有反射鏡結構(A)及密封材堤壩結構(B)的本發明之光學半導體裝置用基板之例的概略圖。 [Fig. 6] is a schematic view showing an example of a substrate for an optical semiconductor device of the present invention having a mirror structure (A) and a seal material dam structure (B).

[第7圖]係顯示本發明之光學半導體裝置之一例的概略剖面圖。 Fig. 7 is a schematic cross-sectional view showing an example of the optical semiconductor device of the present invention.

[第8圖]係顯示具有反射鏡結構(A)及密封材堤壩結構(B)的本發明之光學半導體裝置之例的概略剖面 圖。 [Fig. 8] is a schematic cross-sectional view showing an example of the optical semiconductor device of the present invention having a mirror structure (A) and a sealant dam structure (B) Figure.

以下,雖針對本發明說明實施的形態,但本發明並不限定於此等。 Hereinafter, the embodiments of the present invention will be described, but the present invention is not limited thereto.

以往,期望有機械安定性高,且可實現高耐久性、高散熱性之光學半導體裝置的光學半導體裝置用基板。 In the past, a substrate for an optical semiconductor device having an optical semiconductor device having high mechanical stability and high durability and high heat dissipation performance has been desired.

本發明者等係為了達成上述課題屢經銳意探討。其結果發現,藉由使用具有使聚矽氧樹脂組成物含浸於纖維強化材而硬化的樹脂層之基台,而達成機械安定性、高耐久性,且作為光半導體元件的搭載區域而於基台形成元件搭載用凹部,並藉由於該元件搭載用凹部的內面形成鍍敷層而達成高散熱性,而完成本發明。 The present inventors have repeatedly conducted intensive discussions in order to achieve the above problems. As a result, it has been found that a base having a resin layer which is cured by impregnating the fiber reinforced material with a fiber reinforced material is used to achieve mechanical stability and high durability, and is used as a mounting region of the optical semiconductor element. The present invention is completed by forming a concave portion for mounting the element and forming a plating layer on the inner surface of the concave portion for mounting the element to achieve high heat dissipation.

首先,針對本發明之光學半導體裝置用基板進行說明。 First, the substrate for an optical semiconductor device of the present invention will be described.

[基台] [base]

於第1圖(A)顯示本發明之光學半導體裝置用基板10的俯視圖,於第1圖(B)顯示沿著第1圖(A)之AA線的剖面圖。基台1係於使聚矽氧樹脂組成物含浸於3層之纖維強化材2且經硬化的樹脂層1a之表面(下面)接合有金屬層1b者。如此一來,相較於以往之環氧基板(FR-4等),成為具有以耐熱性高的聚矽氧樹脂為主體之樹脂層1a的基台,藉以成為於耐熱性高之長期環境試 驗(高溫高濕試驗等)中無基台之黃變,且長時間保持高反射率的耐久性優異之光學半導體裝置用基板。並且,如此之基板係機械安定性高,且可撓性優異,容易處理。 A plan view of the substrate 10 for an optical semiconductor device of the present invention is shown in Fig. 1(A), and a cross-sectional view taken along line AA of Fig. 1(A) is shown in Fig. 1(B). The base 1 is a metal layer 1b in which the polysiloxane resin composition is impregnated into the three layers of the fiber-reinforced material 2 and the surface (underside) of the cured resin layer 1a is bonded. In this way, compared with the conventional epoxy substrate (such as FR-4), it is a base having a resin layer 1a mainly composed of a heat-resistant polyoxyxene resin, and is a long-term environmental test with high heat resistance. In the test (such as a high-temperature and high-humidity test), the substrate for an optical semiconductor device having no yellowing of the base and maintaining high reflectance for a long period of time is excellent. Further, such a substrate has high mechanical stability, is excellent in flexibility, and is easy to handle.

基台1之樹脂層1a,係以使用至少1層以上使聚矽氧樹脂組成物含浸於纖維強化材2之預浸體並使其硬化者為佳。 The resin layer 1a of the base 1 is preferably one which is impregnated with the prepreg of the fiber-reinforced material 2 by using at least one layer or more of the polyoxynoxy resin composition.

只要是如上所述者,則成為具有所期望的厚度且機械安定性更為優異者。 As long as it is as described above, it has a desired thickness and is more excellent in mechanical stability.

於高輸出二極體(光輸出高,因而產生大量的廢熱者)時,或於溫度上昇的環境(例如,汽車之引擎附近的頭燈)中使用光學半導體裝置用基板時,關於耐熱性方面被要求嚴苛的要件。只要是本發明之光學半導體裝置用基板,則可對應此等之要求。 When a high-output diode (a light output is high, a large amount of waste heat is generated), or when a substrate for an optical semiconductor device is used in an environment where temperature rises (for example, a headlight near an engine of an automobile), regarding heat resistance Strict requirements are required. As long as it is the substrate for an optical semiconductor device of the present invention, it can meet the requirements of these.

如第1圖(B)所示,於基台1之樹脂層1a側形成有用以收容、搭載光學半導體元件的元件搭載用凹部4。只要元件搭載用凹部4以至少在厚度方向貫穿樹脂層1a的方式形成,則其深度並不特別限定,即使到達金屬層1b的內部者亦可。於元件搭載用凹部4的內面係形成有鍍敷層5。光學半導體元件係被收容、搭載於該被形成的鍍敷層5上之凹形狀部內。 As shown in FIG. 1(B), the element mounting recessed portion 4 for accommodating and mounting the optical semiconductor element is formed on the resin layer 1a side of the base 1. When the element mounting recessed portion 4 is formed to penetrate the resin layer 1a at least in the thickness direction, the depth is not particularly limited, and it may be reached even if it reaches the inside of the metal layer 1b. A plating layer 5 is formed on the inner surface of the element mounting recess 4 . The optical semiconductor element is housed and mounted in a concave portion on the formed plating layer 5.

只要是如上所述者,則可將自光學半導體元件所產生的熱從形成於元件搭載用凹部4的內面之鍍敷層5有效率地排出至外部,而成為具有高散熱性之光學半導體裝置用基板。 As described above, the heat generated from the optical semiconductor element can be efficiently discharged from the plating layer 5 formed on the inner surface of the element mounting recess 4 to the outside, thereby becoming an optical semiconductor having high heat dissipation. Substrate for the device.

基台1的厚度係以儘可能地薄者為佳,較佳為具有例如不因本身重量而彎曲的程度之充分的機械安定性。基台1的厚度係1mm以下,較佳為0.6mm以下,特別佳為0.4mm以下。 The thickness of the base 1 is preferably as thin as possible, and preferably has sufficient mechanical stability such as not to be bent by its own weight. The thickness of the base 1 is 1 mm or less, preferably 0.6 mm or less, and particularly preferably 0.4 mm or less.

金屬層1b及鍍敷層5雖無特別限制,但可藉由銅、鎳、金、鈀、銀、或此等合金而形成。或者,亦可由無機質填充材(透明導電性氧化物(略稱為TCO)乃眾所周知)等之透明的導電性材料形成此等。 The metal layer 1b and the plating layer 5 are not particularly limited, but may be formed of copper, nickel, gold, palladium, silver, or the like. Alternatively, it may be formed of a transparent conductive material such as an inorganic filler (a transparent conductive oxide (abbreviated as TCO)).

如第1圖(B)所示,鍍敷層5係不僅於元件搭載用凹部4的內面,亦可以其上端高於樹脂層1a之表面的方式形成。接著,較佳為基台1之表面的大部分(例如50%以上)係經鍍敷層所覆蓋。金屬一般而言係展現高的熱傳導性,因此藉由將鍍敷層形成於基台1之表面上的大區域,而可使自光學半導體元件所產生的熱有效率地擴散至外部。 As shown in FIG. 1(B), the plating layer 5 is formed not only on the inner surface of the element mounting recess 4 but also on the upper end of the resin layer 1a. Next, it is preferable that most of the surface (for example, 50% or more) of the surface of the base 1 is covered with a plating layer. Since the metal generally exhibits high thermal conductivity, heat generated from the optical semiconductor element can be efficiently diffused to the outside by forming the plating layer on a large area on the surface of the base 1.

如第3圖所示,本發明之光學半導體裝置用基板10,係可成為基台1具有複數元件搭載用凹部4、及與光學半導體元件電連接的至少2個後述之電連接部3者,且採用大面積印刷基板的形態。此外,於光學半導體元件之搭載時前後,亦可將光學半導體裝置用基板10區分為更小的個別單元。 As shown in FIG. 3, the substrate 10 for an optical semiconductor device according to the present invention has the base 1 having a plurality of element mounting recesses 4 and at least two electrical connection portions 3 to be described later that are electrically connected to the optical semiconductor elements. Moreover, the form of the large-area printed substrate is adopted. Further, the optical semiconductor device substrate 10 can be divided into smaller individual units before and after the mounting of the optical semiconductor element.

[聚矽氧樹脂組成物] [Polyoxygenated resin composition]

聚矽氧樹脂係由於耐熱性高,且高耐久性,因介電率 低而為低雜訊性,因此極適合作為基台1之樹脂層1a的構成材料。聚矽氧樹脂組成物雖無特別限制,但為硬化性之聚矽氧樹脂組成物,且以加成硬化型或縮合硬化型之聚矽氧樹脂組成物較為理想。只要是如此之聚矽氧樹脂組成物,則即使為以往之成型裝置亦能夠容易地成形,可容易得到機械特性優異,且表面黏性少的基台。甚至,可容易得到機械特性、耐熱性、耐變色性優異,且表面之黏性少的光學半導體裝置用基板。 Polyoxyl resin is high in heat resistance and high in durability due to dielectric constant Since it is low and has low noise, it is very suitable as a constituent material of the resin layer 1a of the base 1. The polyoxymethylene resin composition is not particularly limited, but is preferably a curable polyoxynene resin composition, and is preferably a addition curing type or a condensation curing type polyoxymethylene resin composition. If it is such a polyoxyxylene resin composition, it can be easily molded even in the conventional molding apparatus, and a base having excellent mechanical properties and a small surface stickiness can be easily obtained. In addition, it is possible to easily obtain a substrate for an optical semiconductor device which is excellent in mechanical properties, heat resistance, and discoloration resistance and has little surface stickiness.

尤其,如同日本特開2010-89493號公報所記載般之使用在室溫為固體狀之聚矽氧樹脂組成物時,使該聚矽氧樹脂組成物以溶解、分散於溶劑的狀態含浸於纖維強化材,使前述溶劑從該纖維強化材蒸發去除之後,該組成物為A階段狀態且成為固形。因而,具有使聚矽氧樹脂組成物含浸於纖維強化材的預浸體之保管變得更為容易,而可更容易進行利用熱加壓機之成型,進而,可更自由地將光學半導體裝置用基板的形狀予以成型之優點。此外,使用此光學半導體裝置用基板所製作出的本發明之光學半導體裝置,係經時的波長(色調)之變化、初期光束或反射率之變化小而成為長壽命。 In particular, when a polyfluorene resin composition which is solid at room temperature is used as described in JP-A-2010-89493, the polyfluorene oxide resin composition is impregnated into the fiber in a state of being dissolved and dispersed in a solvent. In the reinforcing material, after the solvent is evaporated from the fiber reinforcing material, the composition is in the A-stage state and becomes solid. Therefore, it is easier to store the prepreg in which the polyoxynene resin composition is impregnated into the fiber-reinforced material, and it is easier to perform molding by a hot press, and further, the optical semiconductor device can be more freely used. The advantage of molding with the shape of the substrate. Further, the optical semiconductor device of the present invention produced by using the substrate for an optical semiconductor device has a long wavelength change due to a change in wavelength (tone) and a change in initial light beam or reflectance.

此外,可於上述聚矽氧樹脂組成物中添加無機質填充材。具體而言,係使用氧化鋁、二氧化矽、鈦酸鋇、鈦酸鉀、鈦酸鍶、碳酸鈣、碳酸鋁、氫氧化鎂、氫氧化鋁、氮化矽、氮化鋁、氮化硼、碳化矽等。此等之無機質填充材係可單獨,亦可將二種以上合併使用。 Further, an inorganic filler may be added to the above polyoxymethylene resin composition. Specifically, alumina, ceria, barium titanate, potassium titanate, barium titanate, calcium carbonate, aluminum carbonate, magnesium hydroxide, aluminum hydroxide, tantalum nitride, aluminum nitride, boron nitride are used. , carbonized bismuth, etc. These inorganic fillers may be used singly or in combination of two or more.

此無機質填充材的形狀及粒徑並無特別限制。填充材的粒徑一般可設為0.01~50微米,較佳為0.1~20微米。無機質填充材的調配量雖無特別限制者,但一般而言相對於樹脂成分合計100質量份,可添加1~1000質量份,較佳為添加5~800質量份。 The shape and particle diameter of the inorganic filler are not particularly limited. The particle size of the filler material can be generally set to 0.01 to 50 μm, preferably 0.1 to 20 μm. The amount of the inorganic filler is not particularly limited. In general, it is preferably 1 to 1000 parts by mass, and preferably 5 to 800 parts by mass, based on 100 parts by mass of the total of the resin components.

於聚矽氧樹脂組成物中係除無機質填充材以外,亦可添加1以上之添加物質。如此之添加物質,可採用例如擴散介質、染料、濾波器介質、反射介質、變換介質的形態,可列舉例如:發光染料、中空粒子、或者接著促進劑等。依據如此之添加物質,特別是使基板成為具有反射性、穿透性、或吸收性者。如此一來,藉由使用1個或複數之添加物質,而增加基板之設計上的選擇。 In addition to the inorganic filler, the polyoxyxyl resin composition may be added with one or more additional substances. Examples of such a substance to be added include a diffusion medium, a dye, a filter medium, a reflection medium, and a conversion medium, and examples thereof include a luminescent dye, hollow particles, and a subsequent accelerator. According to such an additive, in particular, the substrate is made reflective, penetrating, or absorptive. In this way, the design choice of the substrate is increased by using one or more additive substances.

[纖維強化材] [Fiber reinforced material]

纖維強化材係碳纖維、玻璃纖維、石英玻璃纖維、金屬纖維等之無機纖維、芳香族聚醯胺纖維、聚醯亞胺纖維、聚醯胺醯亞胺纖維等之有機纖維、進而碳化矽纖維、碳化鈦纖維、硼纖維、氧化鋁纖維等,因應製品特性任何一種皆可使用。較佳的纖維係為玻璃纖維、石英纖維、碳纖維等。其中以絕緣性高的玻璃纖維或石英玻璃纖維特別佳。就其他觀點而言,纖維強化材係以對聚矽氧樹脂組成物展現良好的接著性與高的機械負荷能力之材料特別佳。此外,纖維強化材係以至少具有與聚矽氧樹脂組成物相同程度之耐熱性、與低熱膨脹係數為佳。 The fiber reinforced material is an inorganic fiber such as carbon fiber, glass fiber, quartz glass fiber, or metal fiber, an organic fiber such as an aromatic polyamide fiber, a polyimide fiber, or a polyamide fiber, and further, a ruthenium carbide fiber. Titanium carbide fibers, boron fibers, alumina fibers, and the like can be used depending on the characteristics of the product. Preferred fibers are glass fibers, quartz fibers, carbon fibers, and the like. Among them, glass fiber or quartz glass fiber having high insulation is particularly preferable. From other viewpoints, the fiber reinforced material is particularly excellent in a material exhibiting good adhesion to a polyoxyxylene resin composition and high mechanical load capacity. Further, the fiber reinforced material preferably has at least the same heat resistance as the polyoxymethylene resin composition and a low coefficient of thermal expansion.

尤其,只要纖維強化材為玻璃纖維,則成為展現良好的耐紫外線性及耐熱性的基板。進而,藉由使用玻璃纖維,而可確保纖維強化材、與聚矽氧樹脂組成物之良好的接著。此外,玻璃纖維係為低價且處理容易的材料。 In particular, as long as the fiber reinforced material is glass fiber, it becomes a substrate exhibiting excellent ultraviolet resistance and heat resistance. Further, by using glass fibers, it is possible to ensure good adhesion of the fiber-reinforced material and the polyoxymethylene resin composition. Further, the glass fiber is a material which is inexpensive and easy to handle.

在此,於第2圖中模式性地顯示基台1之樹脂層1a內的纖維強化材2之纖維層的纖維2’、2”之方向。如第2圖所示般,纖維強化材2係以具備2層以上之纖維層為佳,以具備4個纖維層為更佳。此外,纖維強化材2之各層的纖維2’、2”係以沿著平行於基台1之主面的方向延伸為佳。一般,於纖維強化材之1個纖維層當中,複數纖維朝向成為實質上平行,而使纖維方向一致。樹脂層具備由複數層所構成的纖維強化材時,各纖維層之纖維方向係以彼此相對旋轉90°為佳。在此,「旋轉」係指以垂直於樹脂層的上面及/或下面的軸線為中心而各層中之纖維的方向彼此旋轉90°。 Here, the direction of the fibers 2' and 2" of the fiber layer of the fiber-reinforced material 2 in the resin layer 1a of the base 1 is schematically shown in Fig. 2. As shown in Fig. 2, the fiber-reinforced material 2 is as shown in Fig. 2 It is preferable to have two or more fiber layers, and it is more preferable to have four fiber layers. Further, the fibers 2', 2" of each layer of the fiber reinforcement 2 are parallel to the main surface of the base 1. The direction extension is better. Generally, in one fiber layer of the fiber reinforced material, the plurality of fiber directions are substantially parallel, and the fiber directions are aligned. When the resin layer is provided with a fiber reinforced material composed of a plurality of layers, the fiber direction of each fiber layer is preferably rotated by 90° relative to each other. Here, "rotation" means that the directions of the fibers in the respective layers are rotated by 90° with respect to each other centering on the axis perpendicular to the upper surface and/or the lower surface of the resin layer.

纖維強化材的形態雖無特別限制,但較佳為將長纖維絲朝特定方向拉齊的粗紗、布帛、不織布等之薄片狀者,進而切股氈(chopped strand mat)等可形成層合體者。 The form of the fiber-reinforced material is not particularly limited, but is preferably a sheet of roving, cloth, or non-woven fabric in which long filaments are drawn in a specific direction, and a laminated body such as a chopped strand mat can be formed. .

此外,纖維強化材係可設為藉由聚矽氧樹脂而完全包圍者。只要是如上所述者,則由於纖維強化材受到聚矽氧樹脂所保護,金屬或金屬離子並未到達纖維,因此可防止例如金屬離子沿著纖維而移動。 Further, the fiber reinforced material may be completely surrounded by a polyoxymethylene resin. As long as it is as described above, since the fiber reinforced material is protected by the polyoxyxene resin, the metal or metal ions do not reach the fibers, so that, for example, metal ions can be prevented from moving along the fibers.

[電連接部] [Electrical connection]

如第1圖(A)(B)所示般,本發明之光學半導體裝置用基板10,係於基台1上面具有與光學半導體元件電連接之至少2個電連接部3。各個電連接部3係可設計成經由金線而連接於光學半導體元件。或者,亦可設計成以倒裝晶片安裝方式連接於光學半導體元件。 As shown in Fig. 1 (A) and (B), the substrate 10 for an optical semiconductor device of the present invention has at least two electrical connection portions 3 electrically connected to the optical semiconductor element on the upper surface of the base 1. Each of the electrical connection portions 3 can be designed to be connected to the optical semiconductor element via a gold wire. Alternatively, it may be designed to be connected to the optical semiconductor element in a flip chip mounting manner.

電連接部3係如第1圖(B)所示般,較佳為藉由鍍敷而形成於電連接部用凹部6的內面,且與金屬層1b電連接者,該電連接部用凹部6係形成於基台1之樹脂層1a側且至少在厚度方向貫穿樹脂層1a。 As shown in FIG. 1(B), the electrical connection portion 3 is preferably formed on the inner surface of the electrical connection portion recessed portion 6 by plating, and is electrically connected to the metal layer 1b. The concave portion 6 is formed on the resin layer 1a side of the base 1 and penetrates the resin layer 1a at least in the thickness direction.

只要是如上所述者,則成為散熱性更為優異,金屬層1b係藉由例如焊錫或接著結合而成為能夠與其他基板之外部連接部電連接者,而可實現基板之省空間的電連接構造。此時,本發明之光學半導體裝置用基板10,係以能夠承受焊錫步驟時所產生的熱應力者為佳。只要是如此之光學半導體裝置用基板,則能夠產率佳地達成例如與光學半導體元件或外部連接部之連接。此時,金屬層1b係以在連接於外部連接部上形成彼此電絕緣的區域為佳。 As described above, the heat dissipation property is further improved, and the metal layer 1b can be electrically connected to the external connection portion of the other substrate by, for example, soldering or bonding, and the space-saving electrical connection of the substrate can be realized. structure. In this case, the substrate 10 for an optical semiconductor device of the present invention is preferably one that can withstand the thermal stress generated in the soldering step. As long as such a substrate for an optical semiconductor device is used, it is possible to achieve, for example, a connection with an optical semiconductor element or an external connection portion with good yield. At this time, the metal layer 1b is preferably formed to be electrically insulated from each other on the external connection portion.

電連接部3之材質,係可設為與上述之元件搭載用凹部4內面的鍍敷層5相同者。 The material of the electrical connection portion 3 can be the same as the plating layer 5 on the inner surface of the component mounting recess 4 described above.

此外,電連接部3及上述金屬層1b係可由1種金屬或金屬合金所構成者,亦可由不同金屬或金屬合金 所構成的複數層所成者。 Further, the electrical connection portion 3 and the metal layer 1b may be composed of one metal or metal alloy, or may be composed of different metals or metal alloys. The plural layers formed by it.

例如,較佳為於電連接部3中,將最接近基台1的位置之第1層設為銅層。第1層的厚度較佳為8μm以上且未達500μm。進而,可於第1層上形成鎳、鈀、金、銀當中至少1種的第2金屬層。此等層的厚度係以未達25μm為佳,以未達5μm特別佳,以未達2μm最佳。尤其於銅層上形成鎳-金層時係以未達500nm為佳。如此之第2層係費用效果高,且可以簡單的步驟形成,進而可有效地進行結構化。 For example, in the electrical connection portion 3, the first layer closest to the position of the base 1 is preferably a copper layer. The thickness of the first layer is preferably 8 μm or more and less than 500 μm. Further, a second metal layer of at least one of nickel, palladium, gold, and silver may be formed on the first layer. The thickness of these layers is preferably less than 25 μm, particularly preferably less than 5 μm, and most preferably less than 2 μm. Particularly, when a nickel-gold layer is formed on the copper layer, it is preferably less than 500 nm. Such a second layer system has a high cost effect and can be formed in a simple step, and can be effectively structured.

[反射鏡結構、密封材堤壩結構] [Mirror structure, seal material dam structure]

如第6圖(A)所示般,本發明之光學半導體裝置用基板20,係可設為於基台上具有熱硬化性樹脂反射鏡結構7者。只要是具有反射鏡結構7者則成為高光束者。反射鏡結構7係只要是圍繞光學半導體元件,且將自光學半導體元件的光反射之結構則無特別限定。或者,如第6圖(B)所示之本發明之光學半導體裝置用基板30般,具有密封材堤壩結構8者亦可。密封材堤壩結構8係形成於光學半導體元件之搭載區域的周圍,且於光學半導體元件之密封時停止密封材的流動,而維持密封材的形狀所需者。 As shown in FIG. 6(A), the substrate 20 for an optical semiconductor device of the present invention can be provided with a thermosetting resin mirror structure 7 on a base. As long as it has the mirror structure 7, it becomes a high beam. The mirror structure 7 is not particularly limited as long as it surrounds the optical semiconductor element and reflects light from the optical semiconductor element. Alternatively, as in the substrate 30 for an optical semiconductor device of the present invention shown in FIG. 6(B), the sealing material dam structure 8 may be used. The sealing material dam structure 8 is formed around the mounting region of the optical semiconductor element, and stops the flow of the sealing material when the optical semiconductor element is sealed, and maintains the shape of the sealing material.

只要反射鏡結構、密封材堤壩結構為熱硬化性樹脂,則成為提昇與基台1之樹脂層的接著性者。但,反射鏡結構、密封材堤壩結構並不限定於藉由樹脂成型所構成者,例如,亦可以使其上端高於基台表面的方式形成 鍍敷層而構成反射鏡結構、密封材堤壩結構,該鍍敷層係形成於元件搭載用凹部4或電連接部用凹部6的內面。 As long as the mirror structure and the sealant dam structure are thermosetting resins, the adhesion to the resin layer of the base 1 is improved. However, the mirror structure and the seal material dam structure are not limited to those formed by resin molding, and for example, the upper end may be formed higher than the surface of the base. The plating layer constitutes a mirror structure and a seal material dam structure, and the plating layer is formed on the inner surface of the element mounting recess 4 or the electrical connection recess 6 .

接著,針對本發之光學半導體裝置用基板之製造方法進行說明。 Next, a method of manufacturing the substrate for an optical semiconductor device of the present invention will be described.

[樹脂層製作步驟] [Resin layer making step]

於樹脂層製作步驟中,使聚矽氧樹脂組成物含浸於纖維強化材並使其硬化而製作樹脂層1a(第4圖之A)。樹脂層1a係以至少1層以上使用預浸體並使其硬化而製作為佳。預浸體係可藉由溶劑法或熱熔法所製造。聚矽氧樹脂組成物、纖維強化材係可使用與上述光學半導體裝置用基板所記載者相同者。 In the resin layer forming step, the polyoxyphthalocene resin composition is impregnated with the fiber-reinforced material and cured to form the resin layer 1a (Fig. 4A). It is preferable that the resin layer 1a is formed by using at least one layer or more of a prepreg and hardening it. The prepreg system can be produced by a solvent method or a hot melt method. The polyoxyxylene resin composition and the fiber reinforced material can be used in the same manner as those described for the above-mentioned substrate for an optical semiconductor device.

於使用溶劑法的情況中,係調製將聚矽氧樹脂組成物溶解於有機溶劑的樹脂清漆,使此樹脂清漆含浸於纖維強化材,藉由加熱去除溶劑而製造預浸體。預浸體的厚度係依據所使用的補強用纖維等之厚度而定,於將基板增厚時係將補強用纖維進行多數層合。 In the case of using the solvent method, a resin varnish in which a polyoxyxylene resin composition is dissolved in an organic solvent is prepared, and the resin varnish is impregnated with the fiber reinforced material, and the solvent is removed by heating to produce a prepreg. The thickness of the prepreg is determined depending on the thickness of the reinforcing fiber or the like to be used, and when the substrate is thickened, the reinforcing fiber is mostly laminated.

更具體而言,係使玻璃布含浸於聚矽氧樹脂組成物之溶液或分散液中,在較佳為50~150℃,更佳為60~120℃之乾燥爐中去除溶劑,藉此而可得到聚矽氧預浸體。 More specifically, the glass cloth is impregnated in a solution or dispersion of the polyoxynoxy resin composition, and the solvent is removed in a drying oven preferably at 50 to 150 ° C, more preferably 60 to 120 ° C. A polyfluorene prepreg can be obtained.

此外,使用熱熔法時,係藉由將固形之聚矽氧組成物加熱、溶解而含浸於纖維強化材,以製造預浸體。 Further, when the hot melt method is used, the prepreg is produced by heating and dissolving the solid polyfluorene oxide composition to be impregnated into the fiber reinforced material.

使用如此方式所製造出的預浸體來製作樹脂層1a。 此時,將與絕緣層的厚度相對應之片數的預浸體重疊,進行加壓加熱而可製成樹脂層1a。 The resin layer 1a was produced using the prepreg produced in this manner. At this time, the number of prepregs corresponding to the thickness of the insulating layer is superimposed, and pressure heating is performed to obtain the resin layer 1a.

[金屬層形成步驟] [Metal layer forming step]

於金屬層形成步驟中,係將金屬層1b接合於樹脂層1a的表面而製作基台1(第4圖之B)。此步驟係可例如以下的方式來實施。 In the metal layer forming step, the metal layer 1b is bonded to the surface of the resin layer 1a to form the base 1 (Fig. 4B). This step can be implemented, for example, in the following manner.

藉由將8~500μm之金屬箔重疊於樹脂層1a的下面,在5~50MPa之壓力、70~180℃之溫度範圍下使用真空加壓機等進行加壓加熱而接合金屬層1b。此時之金屬箔雖無特別限定,但可使用銅、鎳、金、鈀、或銀等,就電性、經濟性的觀點而言係以銅箔較適合使用。 By laminating a metal foil of 8 to 500 μm on the lower surface of the resin layer 1a, the metal layer 1b is joined by pressure heating using a vacuum press or the like at a pressure of 5 to 50 MPa and a temperature range of 70 to 180 °C. The metal foil at this time is not particularly limited, but copper, nickel, gold, palladium, or silver can be used, and a copper foil is suitably used from the viewpoint of electrical and economic efficiency.

[元件搭載用凹部形成步驟] [Step of forming a recess for component mounting]

於元件搭載用凹部形成步驟中,於上述所製作出的基台1形成元件搭載用凹部4(第4圖之C)。此時,元件搭載用凹部4係以至少在厚度方向貫穿樹脂層1a的方式形成。元件搭載用凹部4的深度並無特別限定,亦可以到達金屬層1b的內部,例如距離金屬層1b的表面數十μm以上之深度的方式形成。元件搭載用凹部4係以佔晶粒焊墊或引線接合焊墊之面積的15%~100%為佳。元件搭載用凹部4係可藉由例如銑刀等而形成。此時,可因應需要而形成電連接部用凹部6。 In the element mounting recess forming step, the element mounting recess 4 (C of FIG. 4) is formed on the base 1 thus produced. At this time, the element mounting recessed portion 4 is formed to penetrate the resin layer 1a at least in the thickness direction. The depth of the element mounting recessed portion 4 is not particularly limited, and may be formed so as to reach the inside of the metal layer 1b, for example, a depth of several tens of μm or more from the surface of the metal layer 1b. The element mounting recess 4 is preferably 15% to 100% of the area of the die pad or the wire bonding pad. The element mounting recess 4 can be formed by, for example, a milling cutter or the like. At this time, the recess portion 6 for the electrical connection portion can be formed as needed.

[鍍敷成型步驟] [Plating Step]

於鍍敷形成步驟中係於元件搭載用凹部4的內面形成鍍敷層5(第4圖之D)。如上所述,於藉由鍍敷而將電連接部3形成於電連接部用凹部6的內面之情況中,係如第4圖之D所示般,於元件搭載用凹部4的內面、電連接部用凹部6的內面、基台1的表面整面形成鍍敷層,於其後步驟中進行將此鍍敷層形成於電連接部3的圖型化處理亦可。只要是如上所述,則可容易進行鍍敷形成步驟及後述之電連接部形成步驟。 In the plating forming step, the plating layer 5 is formed on the inner surface of the element mounting recess 4 (D of FIG. 4). As described above, in the case where the electrical connection portion 3 is formed on the inner surface of the electrical connection portion recessed portion 6 by plating, the inner surface of the element mounting recess portion 4 is formed as shown in FIG. 4D. A plating layer is formed on the inner surface of the concave portion 6 for the electrical connection portion and the entire surface of the base 1, and the patterning treatment for forming the plating layer on the electrical connection portion 3 may be performed in the subsequent step. As described above, the plating forming step and the electrical connecting portion forming step which will be described later can be easily performed.

所鍍敷的金屬係可使用與上述光學半導體裝置用基板所記載者相同者。例如,實施銅鍍敷時,以將鋅適量混合於鍍敷液內為佳。此乃鋅會發揮觸媒的功效,而促進銅鍍敷之附著。形成鍍敷的方法並無特別限定,可使用印刷法、浸漬法、蒸鍍、濺鍍法或電鍍法等。為了確保電連接部3與基台1之良好的接著,基台1之電連接部的形成面係以粗面化為佳。 The metal to be plated can be the same as those described in the above substrate for an optical semiconductor device. For example, in the case of performing copper plating, it is preferred to mix an appropriate amount of zinc in the plating solution. This is the effect of zinc on the catalyst and promotes the adhesion of copper plating. The method of forming the plating is not particularly limited, and a printing method, a dipping method, a vapor deposition method, a sputtering method, a plating method, or the like can be used. In order to ensure a good connection between the electrical connection portion 3 and the base 1, the surface on which the electrical connection portion of the base 1 is formed is preferably roughened.

[電連接部形成步驟] [Electrical connection forming step]

於電連接部形成步驟中,將上述步驟所形成的鍍敷層形成於與光學半導體元件電連接的至少2個電連接部3(第4圖之E)。例如,可藉由减去法(subtractive method)或鑽孔加工等之一般所使用的方法來加工鍍敷層,並以蝕刻處理而得到具有電連接部3之基板(印刷配線板)。 In the electrical connection portion forming step, the plating layer formed in the above step is formed on at least two electrical connection portions 3 (E in FIG. 4) electrically connected to the optical semiconductor element. For example, the plating layer can be processed by a method generally used in a subtractive method or a drilling process, and a substrate (printed wiring board) having the electrical connection portion 3 can be obtained by etching.

可藉由使形成於電連接部用凹部6或元件搭載用凹部4的內面之鍍敷層的上端高於基台之表面的方式來形成,而形成反射鏡結構、密封材堤壩結構。 The upper end of the plating layer formed on the inner surface of the electrical connection portion concave portion 6 or the element mounting concave portion 4 can be formed to be higher than the surface of the base, thereby forming a mirror structure and a seal material dam structure.

經過上述步驟,而製造本發明之光學半導體裝置用基板。 Through the above steps, the substrate for an optical semiconductor device of the present invention is produced.

於電連接部形成步驟後,可因應需要而進行熱硬化樹脂之阻劑9等之填充步驟(第4圖之F)、或於由上述之大面積印刷基板的形態之光學半導體裝置用基板得到經個片化之光學半導體裝置用基板的情況中,進行以切割或銑刀所致之切割步驟(無圖示)。 After the step of forming the electrical connection portion, the step of filling the resist 9 of the thermosetting resin or the like (F of FIG. 4) or the substrate for the optical semiconductor device of the above-described large-area printed substrate can be obtained as needed. In the case of a substrate for a sheet of an optical semiconductor device, a cutting step (not shown) by cutting or milling is performed.

於上述方法中,於形成用以收容、搭載光學半導體元件的元件搭載用凹部之步驟中,雖於樹脂層的表面接合金屬層之後的基台形成元件搭載用凹部,但並不限定於此,亦可於接合金屬層之前的樹脂層形成與元件搭載用凹部相對應的貫通孔,其後,將樹脂層與金屬層接合。於元件搭載用凹部形成步驟中,形成複數凹部時,雖因銑刀等之裝置被律速,但可利用如此之方法,進行元件搭載用凹部形成步驟,以減低步驟時間。此時,可藉由以切割模具所致之穿孔而形成樹脂層之貫通孔。 In the above-described method, in the step of forming the element mounting recessed portion for accommodating and mounting the optical semiconductor element, the element mounting recessed portion is formed on the base after the metal layer is bonded to the surface of the resin layer, but the present invention is not limited thereto. A through hole corresponding to the recess for mounting the component may be formed in the resin layer before the metal layer is joined, and then the resin layer and the metal layer may be bonded to each other. In the step of forming the element mounting recesses, when a plurality of recesses are formed, the apparatus such as a milling cutter is legally fast, but the method of forming the recesses for mounting the components can be performed by such a method to reduce the step time. At this time, the through hole of the resin layer can be formed by perforation by cutting the mold.

於第5圖顯示以上述步驟所製造的本發明之光學半導體裝置用基板的例子。 An example of the substrate for an optical semiconductor device of the present invention produced by the above steps is shown in Fig. 5.

於第5圖(A)中,於元件搭載用凹部4的內面形成有鍍敷層5,於鍍敷層5上之凹形狀部內收容、搭載光學半導體元件。此外,由形成於電連接部用凹部6的內面之 鍍敷層形成電連接部3。 In the fifth aspect (A), the plating layer 5 is formed on the inner surface of the element mounting recess 4, and the optical semiconductor element is housed and mounted in the concave portion of the plating layer 5. Further, it is formed by the inner surface of the recess portion 6 for the electrical connection portion. The plating layer forms the electrical connection portion 3.

於第5圖(B)中,係顯示於金屬層形成步驟後將8~500μm之金屬箔13重疊於基台上面,與金屬層形成步驟相同地在5~50MPa之壓力、70~180℃之溫度範圍下使用真空加壓機等實施加壓加熱的步驟,其後,實施元件搭載用凹部形成步驟以後的步驟所得到的基板。 In Fig. 5(B), after the metal layer forming step, the metal foil 13 of 8 to 500 μm is superposed on the upper surface of the substrate, and the pressure is 5 to 50 MPa and 70 to 180 ° C in the same manner as the metal layer forming step. The step of performing pressure heating using a vacuum presser or the like is performed in the temperature range, and thereafter, the substrate obtained by the step after the step of forming the element mounting recess is performed.

於第5圖(C)中,係顯示藉由從基台的下面側實施元件搭載用凹部形成步驟,其後,對於其下面實施鍍敷形成步驟以後的步驟所得到的基板,將元件搭載用凹部朝向下地作配置。此時,於使用此基板所製造出的光學半導體裝置與外部基板搭載時之焊錫中,可期待以錨定效應(anchor effect)所致之接著強度的提昇。 In the fifth aspect (C), the step of forming the element mounting recesses is performed from the lower surface side of the base, and thereafter, the substrate obtained by performing the steps after the plating forming step on the lower surface is used for mounting the elements. The recess is arranged downward. At this time, in the solder when the optical semiconductor device manufactured using the substrate and the external substrate are mounted, an improvement in the adhesion strength due to an anchor effect can be expected.

於第5圖(D)中,係為於接合金屬層前之樹脂層形成與元件搭載用凹部4相對應的貫通孔,其後,將樹脂層與金屬層接合所得到的基板。於此基板中,元件搭載用凹部4的下端之位置係與樹脂層的下端成為同一。 In the fifth aspect (D), a through hole corresponding to the element mounting recess 4 is formed in the resin layer before the bonding of the metal layer, and then the obtained resin layer and the metal layer are bonded to each other. In this substrate, the position of the lower end of the element mounting recess 4 is the same as the lower end of the resin layer.

此外,如第6圖(A)所示般,可於基台上將熱硬化性樹脂之反射鏡結構7、或密封材堤壩結構8予以成型。或者,如上所述,只要於鍍敷形成步驟中,以使其上端高於基台表面的方式形成鍍敷層而構成反射鏡結構、密封材堤壩結構,則可省略反射鏡結構或密封材堤壩結構的成型步驟,而低成本化,該鍍敷層係形成於元件搭載用凹部4或電連接部用凹部6的內面。 Further, as shown in Fig. 6(A), the thermosetting resin mirror structure 7 or the sealant dam structure 8 can be molded on the base. Alternatively, as described above, the mirror structure or the seal dam may be omitted as long as the plating layer is formed to form the mirror structure and the seal material dam structure in such a manner that the upper end thereof is higher than the surface of the base. In the molding step of the structure, the plating layer is formed on the inner surface of the element mounting recess 4 or the electrical connection recess 6 .

接著,針對本發明之光學半導體裝置進行說 明。 Next, the optical semiconductor device of the present invention is described Bright.

如第7圖所示般,本發明之光學半導體裝置11,係將光學半導體元件12收容、搭載於上述本發明之光學半導體裝置用基板10之元件搭載用凹部4並加以密封所製造者。本發明之光學半導體裝置11,係為使用本發明之光學半導體裝置用基板者,因此機械安定性高,且成為高耐久性、高散熱性者。於第7圖中,雖顯示正面(face up)型光學半導體裝置,但亦可為倒裝晶片型之光學半導體裝置,此時相同地,機械安定性高,且成為高耐久性、高散熱性者。 As shown in Fig. 7, the optical semiconductor device 11 of the present invention is manufactured by mounting and mounting the optical semiconductor element 12 on the element mounting recess 4 of the optical semiconductor device substrate 10 of the present invention. In the optical semiconductor device 11 of the present invention, since the substrate for an optical semiconductor device of the present invention is used, it has high mechanical stability and high durability and high heat dissipation. In the seventh embodiment, a face up type optical semiconductor device is shown, but it may be a flip chip type optical semiconductor device. In this case, mechanical stability is high, and high durability and high heat dissipation are obtained. By.

[反射鏡結構、密封材堤壩結構] [Mirror structure, seal material dam structure]

如第8圖(A)所示般,本發明之光學半導體裝置21,係為於基台上具有熱硬化性樹脂之反射鏡結構7者。只要是具有反射鏡結構7者則成為高光束者。反射鏡結構7係只要是圍繞光學半導體元件,且將自光學半導體元件的光反射的結構則無特別限定。或者,如第8圖(B)所示般,具有密封材堤壩結構8者亦可。密封材堤壩結構8係形成於光學半導體元件之搭載區域的周圍,且於光學半導體元件之密封時停止密封材的流動,而維持密封材的形狀。如此一來,藉由於基台的表面形成以熱硬化性樹脂所致之反射鏡結構或密封材堤壩結構,而成為耐久性更為提昇之高機能的光學半導體裝置31。 As shown in Fig. 8(A), the optical semiconductor device 21 of the present invention is a mirror structure 7 having a thermosetting resin on a base. As long as it has the mirror structure 7, it becomes a high beam. The mirror structure 7 is not particularly limited as long as it surrounds the optical semiconductor element and reflects light from the optical semiconductor element. Alternatively, as shown in Fig. 8(B), the sealing material dam structure 8 may be used. The sealing material dam structure 8 is formed around the mounting region of the optical semiconductor element, and stops the flow of the sealing material when the optical semiconductor element is sealed, and maintains the shape of the sealing material. In this way, the mirror structure or the seal dam structure which is made of a thermosetting resin is formed on the surface of the base, and the optical semiconductor device 31 having higher durability is improved.

反射鏡結構及密封材堤壩結構所使用的熱硬 化性樹脂之例係可列舉:1)熱硬化性聚矽氧組成物、2)由三嗪衍生物環氧樹脂、酸酐、硬化促進劑、無機質填充劑所構成的熱硬化性環氧樹脂組成物、3)由熱硬化性聚矽氧樹脂與環氧樹脂所構成的混合樹脂(混成樹脂)組成物等。但,熱硬化性樹脂並不限定於此等,只要配合最終光學半導體裝置之使用用途而決定即可。 The mirror structure and the heat hard used in the seal dam structure Examples of the chemical resin include: 1) a thermosetting polyfluorene composition, and 2) a thermosetting epoxy resin composed of a triazine derivative epoxy resin, an acid anhydride, a curing accelerator, and an inorganic filler. And 3) a mixed resin (mixed resin) composition composed of a thermosetting polyoxyxylene resin and an epoxy resin. However, the thermosetting resin is not limited thereto, and may be determined in accordance with the use of the final optical semiconductor device.

上述1)之熱硬化性聚矽氧樹脂組成物係以下述平均組成式(1)所表示的縮合型熱硬化性聚矽氧樹脂組成物等為代表者。 The thermosetting polyoxyphthalocene resin composition of the above 1) is represented by the condensation type thermosetting polyanthracene resin composition represented by the following average composition formula (1).

R1 aSi(OR2)b(OH)cO(4-a-b-c)/2 (1)(式中,R1係表示相同或相異的碳數1~20之有機基,R2係表示相同或相異的碳數1~4之有機基,且滿足0.8≦a≦1.5、0≦b≦0.3、0.001≦c≦0.5、0.801≦a+b+c<2之數)。 R 1 a Si(OR 2 ) b (OH) c O (4-abc)/2 (1) (wherein R 1 represents the same or different organic groups having 1 to 20 carbon atoms, and R 2 represents The same or different organic groups having 1 to 4 carbon atoms, and satisfying 0.8≦a≦1.5, 0≦b≦0.3, 0.001≦c≦0.5, 0.801≦a+b+c<2).

其他亦可使用加成硬化型聚矽氧樹脂組成物。 Other addition-type hardening type polyoxymethylene resin compositions can also be used.

上述2)之熱硬化性環氧樹脂組成物之三嗪衍生物環氧樹脂,就耐熱性、耐光性等之觀點而言係以1,3,5-三嗪核衍生物環氧樹脂為佳。熱硬化性環氧樹脂組成物並不限於由三嗪衍生物、作為硬化劑之酸酐等所構成者,亦可適當使用以往所周知的環氧樹脂或胺、酚硬化劑等。 The triazine derivative epoxy resin of the thermosetting epoxy resin composition of the above 2) is preferably a 1,3,5-triazine core derivative epoxy resin from the viewpoints of heat resistance, light resistance and the like. . The thermosetting epoxy resin composition is not limited to those composed of a triazine derivative or an acid anhydride as a curing agent, and an epoxy resin, an amine, a phenol curing agent, or the like which is conventionally known can be suitably used.

上述3)之聚矽氧樹脂與環氧樹脂之混合樹脂係可列舉:由環氧樹脂與聚矽氧樹脂所構成的共聚物等。 The mixed resin of the polyoxyxylene resin and the epoxy resin of the above 3) may, for example, be a copolymer composed of an epoxy resin and a polyoxyxylene resin.

可於上述聚矽氧樹脂或環氧樹脂之組成物中 調配無機填充材。所調配的無機填充材一般係可使用調配於聚矽氧樹脂組成物或環氧樹脂組成物等者。可列舉例如:熔融二氧化矽、結晶性二氧化矽等之二氧化矽類、氧化鋁、氮化矽、氮化鋁、氮化硼、玻璃纖維、矽灰石(wollastonite)等之纖維狀填充材、三氧化二銻等。此等無機填充材的平均粒徑或形狀並無特別限定。 In the composition of the above polyoxyl resin or epoxy resin Formulated with inorganic fillers. The inorganic filler to be blended is generally used in a composition such as a polyoxyxylene resin composition or an epoxy resin composition. For example, fibrous filling such as cerium oxide such as molten cerium oxide or crystalline cerium oxide, alumina, tantalum nitride, aluminum nitride, boron nitride, glass fiber, or wollastonite may be mentioned. Materials, antimony trioxide, etc. The average particle diameter or shape of these inorganic fillers is not particularly limited.

可於本發明所使用的樹脂組成物中調配二氧化鈦。二氧化鈦係作為白色著色材,為了提高白色度,提昇光的反射效率而調配者,此二氧化鈦之單位格子係金紅石型、銳鈦礦型中任一者皆無妨。此外,平均粒徑或形狀亦不受限定。二氧化鈦係為了提高與樹脂或無機填充材之相溶性、分散性,可以Al或Si等之水合氧化物(hydrous oxide)等預先進行表面處理。 Titanium dioxide can be formulated in the resin composition used in the present invention. Titanium dioxide is used as a white coloring material, and it is suitable for any one of the rutile type and the anatase type of titanium dioxide in order to improve the whiteness and enhance the reflection efficiency of light. Further, the average particle diameter or shape is also not limited. In order to improve the compatibility with the resin or the inorganic filler, the titanium dioxide may be subjected to surface treatment in advance such as hydrous oxide such as Al or Si.

二氧化鈦的填充量係組成物全體的2~30質量%,特別是以5~10質量%為佳。未達2質量%時會有無法得到充分的白色度之情況,若超過30質量%則會有未填充或空隙等成型性降低之情況。 The amount of titanium dioxide to be added is 2 to 30% by mass of the entire composition, particularly preferably 5 to 10% by mass. When it is less than 2% by mass, sufficient whiteness may not be obtained, and if it exceeds 30% by mass, moldability such as unfilling or voids may be lowered.

本發明之光學半導體裝置,係可作為將以被要求有例如高耐久性或高散熱性的汽車產業機器的投影為目的之照明裝置或機器的存在通知外部之標誌燈使用。進而,亦可使用於一般家庭中之室內用照明或液晶的背光。 The optical semiconductor device of the present invention can be used as an indicator lamp for notifying the outside of the illuminating device or the device for the purpose of projection of an automobile industrial machine requiring high durability or high heat dissipation. Further, it can also be used for indoor lighting or liquid crystal backlights in general households.

[實施例] [Examples]

以下,雖顯示本發明之實施例及比較例來更 具體地說明本發明,但本發明並不限定於此等。 Hereinafter, although the examples and comparative examples of the present invention are shown, The present invention will be specifically described, but the present invention is not limited thereto.

(實施例1) (Example 1)

將每1片70μm之薄片2層層合,使200μm之銅層(金屬層)熱壓著於下面而製作出基台,該薄片係使含有氧化鈦作為無機質填充材的苯基系聚矽氧樹脂組成物含浸於玻璃纖維。接著,藉由銑刀(router)而形成元件搭載用凹部及電連接部用凹部,而成為殘留銅層之下面板厚100μm的狀態。其後,藉由無電解鍍敷而於基台上面、元件搭載用凹部及電連接部用凹部的內面之全面形成銅鍍敷。其後,藉由蝕刻處理而於基台上面形成2個電連接部,進而於其表面形成實施了Ni/Pd/Au之鍍敷的金屬被覆層,而得到本發明之光學半導體裝置用基板。 Two sheets of 70 μm sheets were laminated, and a 200 μm copper layer (metal layer) was heat-pressed underneath to form a base which was made of phenyl polyoxynitride containing titanium oxide as an inorganic filler. The resin composition is impregnated with glass fibers. Then, the element mounting recessed portion and the electrical connecting portion recessed portion are formed by a router, and the thickness of the panel below the residual copper layer is 100 μm. Thereafter, copper plating is formed on the entire surface of the base, the element mounting recess, and the inner surface of the electrical connection recess by electroless plating. Thereafter, two electrical connection portions are formed on the upper surface of the substrate by etching, and a metal coating layer on which Ni/Pd/Au plating is applied is formed on the surface thereof to obtain a substrate for an optical semiconductor device of the present invention.

接著,對於基板的表面以100W/30秒實施電漿處理,對於該處理面藉由轉移模具並使用聚矽氧樹脂組成物將反射鏡結構予以成型。將光學半導體元件收容、搭載於元件搭載用凹部內面的鍍敷層上之凹形狀部內。將聚矽氧系晶粒黏合材(信越化學製:商品名632DA-1)沖壓塗佈於反射鏡內的座孔部,搭載藍色LED晶片(Cree製TR350M系列),以150℃ 4小時使其硬化。其後,以直徑30μm的金線將電連接部與藍色LED晶片進行引線接合(Wire Bonding)。 Next, a plasma treatment was performed on the surface of the substrate at 100 W/30 seconds, and the mirror structure was molded for the treated surface by transferring the mold and using a polyoxymethylene resin composition. The optical semiconductor element is housed and mounted in a concave portion on the plating layer on the inner surface of the element mounting recess. A polyxylene-based die-bonding material (manufactured by Shin-Etsu Chemical Co., Ltd.: trade name: 632DA-1) was press-coated on a hole in the mirror, and a blue LED chip (TR350M series manufactured by Cree) was mounted and allowed to stand at 150 ° C for 4 hours. It hardens. Thereafter, the electrical connection portion and the blue LED wafer were wire bonded (wire bonding) with a gold wire having a diameter of 30 μm.

然後,於反射鏡內,以Musashi-engineering製分注器塗佈混練有黃色螢光體與聚矽氧樹脂組成物(信 越化學製:商品名KJR-9022)的內襯材之後,以150℃ 4小時使其熱硬化。熱硬化後,經過切割步驟,予以個片化,而得到如第8圖(A)所示的本發明之光學半導體裝置。 Then, in the mirror, the composition of the yellow phosphor and the polyoxyn resin is kneaded and coated by a distributor of Musashi-engineering (letter The inner lining material of Koshihisa Chemical Co., Ltd., trade name: KJR-9022) was thermally cured at 150 ° C for 4 hours. After the heat curing, it is subjected to a dicing step to form a sheet, and an optical semiconductor device of the present invention as shown in Fig. 8 (A) is obtained.

(比較例1、2) (Comparative Examples 1, 2)

除使用FR-4基板(比較例1)、AlN基板(比較例2)作為基台以外,與實施例1相同的方式,製作出光學半導體裝置。 An optical semiconductor device was produced in the same manner as in Example 1 except that the FR-4 substrate (Comparative Example 1) and the AlN substrate (Comparative Example 2) were used as the base.

然後,對於實施例1、比較例1~2所製作出的光學半導體裝置,實施85℃/85%的高溫高濕通電試驗,而確認出100h、500h、1,000h初期光束值之變動狀況。將其結果顯示於表1。若將初期光束設為100%則實施例1之光學半導體裝置係維持與作為陶瓷之AlN基板(比較例2)的光學半導體裝置相同程度之光束。 Then, the optical semiconductor device produced in Example 1 and Comparative Examples 1 and 2 was subjected to a high-temperature and high-humidity electric current test at 85 ° C / 85%, and the change in the initial beam values at 100 h, 500 h, and 1,000 h was confirmed. The results are shown in Table 1. When the initial beam is set to 100%, the optical semiconductor device of the first embodiment maintains a light beam of the same level as the optical semiconductor device of the ceramic AlN substrate (Comparative Example 2).

進而,對於實施例1、比較例1~2所製作出的光學半導體裝置,實施85℃/85%的高溫高濕通電試驗,而確認出100h、500h、1,000h之光學半導體裝置的 反射率之變動狀況。將其結果顯示於表2。若將初期反射率設為100%則實施例1之光學半導體裝置係可將反射率維持在與作為樹脂之FR-4基板(比較例1)的光學半導體裝置相同程度以上。 Further, in the optical semiconductor device produced in Example 1 and Comparative Examples 1 and 2, a high-temperature and high-humidity electric current test at 85 ° C / 85% was performed, and an optical semiconductor device of 100 h, 500 h, and 1,000 h was confirmed. The change in reflectivity. The results are shown in Table 2. When the initial reflectance is set to 100%, the optical semiconductor device of the first embodiment can maintain the reflectance to the same level or more as that of the optical semiconductor device of the FR-4 substrate (Comparative Example 1).

進而,將實施例1所使用的光學半導體裝置用基板與比較例1、2所使用的基板之熱傳導率進行比較。熱傳導率係藉由雷射閃光法(laser flash method),於室溫25℃中進行測量。將結果顯示於表3。本發明之光學半導體裝置用基板之熱傳導率係成為350W/mK,以往之FR-4基板係成為0.6W/mK,AlN基板係成為150W/mK。由此可知:本發明之光學半導體裝置用基板,相較於其他基板係具有較高的熱傳導率。 Further, the thermal conductivity of the substrate for an optical semiconductor device used in Example 1 and the substrate used in Comparative Examples 1 and 2 were compared. The thermal conductivity was measured by a laser flash method at room temperature of 25 °C. The results are shown in Table 3. The thermal conductivity of the substrate for an optical semiconductor device of the present invention is 350 W/mK, and the conventional FR-4 substrate is 0.6 W/mK, and the AlN substrate is 150 W/mK. From this, it is understood that the substrate for an optical semiconductor device of the present invention has a high thermal conductivity compared to other substrate systems.

(實施例2、3) (Examples 2 and 3)

除了將反射鏡結構予以成型時,在轉移成型中使用環氧樹脂(實施例2)或者聚矽氧樹脂與環氧樹脂之混合樹脂(實施例3)以外,與實施例1相同的方式,製作出光學半導體裝置。 In the same manner as in the first embodiment, except that the epoxy resin (Example 2) or the mixed resin of the polyoxynated resin and the epoxy resin (Example 3) was used for the transfer molding. An optical semiconductor device is provided.

對於實施例2~3所製作出的光學半導體裝置,實施85℃/85%的高溫高濕通電試驗,而確認出100h、500h、1,000h之初期光束值之變動狀況。將其結果顯示於表4。由於基台之耐久性高,因此2種類當中均無較大的光束降低,可知為良好。 In the optical semiconductor devices produced in Examples 2 to 3, a high-temperature and high-humidity electric current test at 85 ° C / 85% was carried out, and the initial beam values of 100 h, 500 h, and 1,000 h were confirmed. The results are shown in Table 4. Since the durability of the base is high, there is no large beam reduction in both types, and it is known to be good.

另外,本發明並不限定於上述實施形態。上述實施形態係為例示,具有與本發明之申請專利範圍所記載之技術思想實質上相同的構造,且發揮相同的作用效果者,任一者皆包含於本發明之技術性範圍中。 Further, the present invention is not limited to the above embodiment. The above-described embodiments are exemplified, and have substantially the same structure as the technical idea described in the patent application scope of the present invention, and all of them have the same effects, and are included in the technical scope of the present invention.

1‧‧‧基台 1‧‧‧Abutment

1a‧‧‧樹脂層 1a‧‧‧ resin layer

1b‧‧‧金屬層 1b‧‧‧ metal layer

2‧‧‧纖維強化材 2‧‧‧Fiber-reinforced materials

3‧‧‧電連接部 3‧‧‧Electrical connection

4‧‧‧元件搭載用凹部 4‧‧‧Component mounting recess

5‧‧‧鍍敷層 5‧‧‧ plating layer

6‧‧‧電連接部用凹部 6‧‧‧ recess for electrical connection

10‧‧‧光學半導體裝置用基板 10‧‧‧Substrate for optical semiconductor devices

Claims (12)

一種光學半導體裝置用基板,其係具有與光學半導體元件電連接之至少2個電連接部之光學半導體裝置用基板,其特徵為,具有:使聚矽氧樹脂組成物含浸於纖維強化材,經硬化的樹脂層表面接合有金屬層的基台,於該基台之前述樹脂層側形成有用以收容、搭載前述光學半導體元件之至少在厚度方向貫穿前述樹脂層的元件搭載用凹部,且於該元件搭載用凹部的內面形成有鍍敷層者。 A substrate for an optical semiconductor device, comprising: a substrate for an optical semiconductor device having at least two electrical connection portions electrically connected to an optical semiconductor element, wherein the polyfluorene resin composition is impregnated with a fiber reinforced material, a base of the metal layer is bonded to the surface of the hardened resin layer, and an element mounting recessed portion that penetrates the resin layer at least in the thickness direction of the optical semiconductor element is formed on the resin layer side of the base. A plating layer is formed on the inner surface of the element mounting recess. 如申請專利範圍第1項所記載之光學半導體裝置用基板,其中前述電連接部係藉由鍍敷而形成於電連接部用凹部的內面,且與前述金屬層電連接者,該電連接部用凹部係形成於前述基台之前述樹脂層側且至少在厚度方向貫穿前述樹脂層。 The substrate for an optical semiconductor device according to the first aspect of the invention, wherein the electrical connection portion is formed on the inner surface of the recess portion of the electrical connection portion by plating, and is electrically connected to the metal layer. The recess portion for the portion is formed on the resin layer side of the base and penetrates the resin layer at least in the thickness direction. 如申請專利範圍第1項所記載之光學半導體裝置用基板,其中前述纖維強化材為玻璃纖維。 The substrate for an optical semiconductor device according to the first aspect of the invention, wherein the fiber reinforced material is a glass fiber. 如申請專利範圍第1項至第3項中任一項所記載之光學半導體裝置用基板,其中前述基台之樹脂層係使用至少1層以上使前述聚矽氧樹脂組成物含浸於前述纖維強化材之預浸體並使其硬化者。 The substrate for an optical semiconductor device according to any one of the first aspect, wherein the resin layer of the base is at least one layer or more, and the polyfluorene resin composition is impregnated with the fiber reinforcement. The prepreg of the material and harden it. 如申請專利範圍第1項至第3項中任一項所記載之光學半導體裝置用基板,其中前述聚矽氧樹脂組成物係縮合硬化型或加成硬化型之聚矽氧樹脂組成物。 The substrate for an optical semiconductor device according to any one of claims 1 to 3, wherein the polyoxyxylene resin composition is a condensation-hardening type or an addition-curable polyphthalocene resin composition. 如申請專利範圍第1項至第3項中任一項所記載之 光學半導體裝置用基板,其中於前述基台上具有熱硬化性樹脂之反射鏡結構或密封材堤壩結構者。 As described in any one of items 1 to 3 of the patent application scope A substrate for an optical semiconductor device having a mirror structure of a thermosetting resin or a seal material dam structure on the base. 一種光學半導體裝置,其係將光學半導體元件搭載於如申請專利範圍第1項至第6項中任一項所記載之光學半導體裝置用基板。 An optical semiconductor device in which an optical semiconductor device is mounted on a substrate for an optical semiconductor device according to any one of the first to sixth aspects of the invention. 一種光學半導體裝置用基板之製造方法,其係製造具有與光學半導體元件電連接之至少2個電連接部之光學半導體裝置用基板的方法,其特徵為包含:使聚矽氧樹脂組成物含浸於纖維強化材,經硬化的樹脂層表面接合有金屬層的基台之前述樹脂層側,形成有用以收容、搭載前述光學半導體元件之至少在厚度方向貫穿前述樹脂層的元件搭載用凹部之步驟、與於前述元件搭載用凹部的內面形成鍍敷層之步驟。 A method for producing a substrate for an optical semiconductor device, which is a method for producing a substrate for an optical semiconductor device having at least two electrical connection portions electrically connected to an optical semiconductor element, comprising: impregnating a polyoxyxylene resin composition with a fiber-reinforced material, the resin layer side of the base of the metal layer is bonded to the surface of the hardened resin layer, and a step of accommodating and mounting the element semiconductor mounting recessed portion of the optical semiconductor element that penetrates the resin layer at least in the thickness direction is formed. A step of forming a plating layer on the inner surface of the element mounting recess. 如申請專利範圍第8項所記載之光學半導體裝置用基板之製造方法,其中於形成用以收容、搭載前述光學半導體元件的元件搭載用凹部之步驟中,於前述樹脂層表面接合有前述金屬層之後的前述基台形成前述元件搭載用凹部。 In the method of manufacturing a substrate for an optical semiconductor device according to the eighth aspect of the invention, in the step of forming the recess for mounting the component for accommodating and mounting the optical semiconductor element, the metal layer is bonded to the surface of the resin layer. The subsequent base is formed as the element mounting recess. 如申請專利範圍第8項所記載之光學半導體裝置用基板之製造方法,其中於形成用以收容、搭載前述光學半導體元件的元件搭載用凹部之步驟中,於接合前述金屬層之前的前述樹脂層形成與前述元件搭載用凹部相對應的貫通孔,其後,將前述樹脂層與前述金屬層予以接合。 The method for producing a substrate for an optical semiconductor device according to the eighth aspect of the invention, wherein the resin layer before bonding the metal layer is formed in a step of forming a recess for mounting an element for accommodating and mounting the optical semiconductor element A through hole corresponding to the recess for mounting the component is formed, and then the resin layer and the metal layer are bonded to each other. 如申請專利範圍第8項至第10項中任一項所記載 之光學半導體裝置用基板之製造方法,其係具有:於前述基台之前述樹脂層側形成至少在厚度方向貫穿前述樹脂層的電連接部用凹部,且藉由鍍敷而於該電連接部用凹部的內面形成與前述金屬層電連接的前述電連接部之步驟。 As described in any of items 8 to 10 of the patent application scope In the method for producing a substrate for an optical semiconductor device, the recess portion for the electrical connection portion that penetrates the resin layer at least in the thickness direction is formed on the resin layer side of the base, and the electrical connection portion is formed by plating. The step of forming the aforementioned electrical connection portion electrically connected to the metal layer is formed by the inner surface of the recess. 如申請專利範圍第8項至第10項中任一項所記載之光學半導體裝置用基板之製造方法,其係具有:於前述基台上形成熱硬化性樹脂之反射鏡結構或密封材堤壩結構之步驟。 The method for producing a substrate for an optical semiconductor device according to any one of the items of the present invention, comprising: a mirror structure or a seal material dam structure in which a thermosetting resin is formed on the base; The steps.
TW102112185A 2012-04-04 2013-04-03 A substrate for an optical semiconductor device, a method for manufacturing the same, and an optical semiconductor device TWI535068B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2012085195A JP5770674B2 (en) 2012-04-04 2012-04-04 Optical semiconductor device substrate, method for manufacturing the same, and optical semiconductor device

Publications (2)

Publication Number Publication Date
TW201405880A true TW201405880A (en) 2014-02-01
TWI535068B TWI535068B (en) 2016-05-21

Family

ID=49368522

Family Applications (1)

Application Number Title Priority Date Filing Date
TW102112185A TWI535068B (en) 2012-04-04 2013-04-03 A substrate for an optical semiconductor device, a method for manufacturing the same, and an optical semiconductor device

Country Status (4)

Country Link
JP (1) JP5770674B2 (en)
KR (1) KR20130112781A (en)
CN (1) CN103367603A (en)
TW (1) TWI535068B (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5924292B2 (en) * 2013-02-25 2016-05-25 株式会社デンソー Carbon fiber reinforced resin molded article and composite structure
JP6330365B2 (en) * 2014-02-27 2018-05-30 セイコーエプソン株式会社 Bonding method, bonded body manufacturing apparatus, bonded body, inkjet head unit, and inkjet recording apparatus

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009021426A (en) * 2007-07-12 2009-01-29 Sharp Corp Chip component type led and method of manufacturing the same
JP5052326B2 (en) * 2007-10-31 2012-10-17 シャープ株式会社 Chip component type LED and manufacturing method thereof
DE102008025491A1 (en) * 2008-05-28 2009-12-03 Osram Opto Semiconductors Gmbh Optoelectronic semiconductor component and printed circuit board
JP5471180B2 (en) * 2008-09-11 2014-04-16 信越化学工業株式会社 Silicone laminated substrate, method for producing the same, silicone resin composition for producing silicone laminated substrate, and LED device

Also Published As

Publication number Publication date
CN103367603A (en) 2013-10-23
JP2013214675A (en) 2013-10-17
JP5770674B2 (en) 2015-08-26
TWI535068B (en) 2016-05-21
KR20130112781A (en) 2013-10-14

Similar Documents

Publication Publication Date Title
KR101153766B1 (en) Multilayer wiring substrate having cavity portion
TWI468087B (en) Led wiring board, light emitting module, method for manufacturing led wiring board and method for manufacturing light emitting module
JP5177319B2 (en) Metal substrate and light source device
CN1170314C (en) Polymer-ceramic composite electronic substrate
JP5232369B2 (en) Manufacturing method of package substrate for mounting optical semiconductor element and manufacturing method of optical semiconductor device using the same
JP5381869B2 (en) Epoxy resin precursor composition, prepreg, laminate, resin sheet, printed wiring board, and semiconductor device
JP5767160B2 (en) Manufacturing method of substrate for optical semiconductor device
KR101999957B1 (en) Package for optical semiconductor device and method thereof, optical semiconductor device and method thereof
CN102292835A (en) Semiconductor device and method for manufacturing same
KR101496061B1 (en) Metal foil laminate, substrate for mounting led, and light source device
TWI424510B (en) Circuit board manufacturing method and semiconductor manufacturing device
TWI535068B (en) A substrate for an optical semiconductor device, a method for manufacturing the same, and an optical semiconductor device
KR20080071494A (en) Heat conductive paste, light emitting diode substrate using the same and manufacturing method thereof
JP6031148B2 (en) Optical semiconductor device substrate and optical semiconductor device
JP5851875B2 (en) Method for manufacturing package for optical semiconductor device and method for manufacturing optical semiconductor device
JP5773630B2 (en) Light-emitting element mounting substrate and manufacturing method thereof
JP5653893B2 (en) Laminated board
KR101526568B1 (en) Bonding method of ceramics substrate and metal fiol, light emitting diode and method for fabricating the same
JP2015181201A (en) Manufacturing method of package substrate for mounting optical semiconductor element and manufacturing method of optical semiconductor device using the same
JP2007194268A (en) Optical semiconductor device
JP2015048452A (en) Cyanate ester resin prepreg, laminate substrate, cyanate ester resin metal-clad laminate, and led mounting substrate
KR101118040B1 (en) Led package and manufacturing method of the same
JP2012209472A (en) Led mounting board