TW201350835A - Method of inspecting a wetting-up state of solder, automatic appearance inspecting device and substrate inspecting system using such a method - Google Patents

Method of inspecting a wetting-up state of solder, automatic appearance inspecting device and substrate inspecting system using such a method Download PDF

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TW201350835A
TW201350835A TW102113391A TW102113391A TW201350835A TW 201350835 A TW201350835 A TW 201350835A TW 102113391 A TW102113391 A TW 102113391A TW 102113391 A TW102113391 A TW 102113391A TW 201350835 A TW201350835 A TW 201350835A
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solder
image
inspection
substrate
amount
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TW102113391A
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Yasuhiro Ohnishi
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Omron Tateisi Electronics Co
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2518Projection by scanning of the object
    • G01B11/2527Projection by scanning of the object with phase change by in-plane movement of the patern
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956Inspecting patterns on the surface of objects
    • G01N21/95684Patterns showing highly reflecting parts, e.g. metallic elements
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956Inspecting patterns on the surface of objects
    • G01N2021/95638Inspecting patterns on the surface of objects for PCB's
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956Inspecting patterns on the surface of objects
    • G01N2021/95638Inspecting patterns on the surface of objects for PCB's
    • G01N2021/95646Soldering
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956Inspecting patterns on the surface of objects
    • G01N2021/95638Inspecting patterns on the surface of objects for PCB's
    • G01N2021/95661Inspecting patterns on the surface of objects for PCB's for leads, e.g. position, curvature
    • G01N2021/95669Inspecting patterns on the surface of objects for PCB's for leads, e.g. position, curvature for solder coating, coverage

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Electric Connection Of Electric Components To Printed Circuits (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

The present invention is to provide a technique capable of determining a wetting-up state of solder in a soldered portion comprising a location where measurement of the appearance is difficult. After a solder printing process, inspection of a post-reflow inspection device 30 is performed onto a substrate, onto which a part mounting process and a reflow process are performed, after amount of cream solder applied to each land is measured. In this inspection device 30, photographing of a camera 302 which is in a state directly viewing a substrate surface of the inspection device is performed under illumination of an illumination device 305; with respect to the soldered portion which has a feature not appeared in a generated image and in which cream solder measured in regard to the corresponding land fulfills a predetermined excellent condition, a feature which is the featured not appeared in the image and related to a shape of a location of the soldered portion not appeared in the image is measured; and the fact whether wetting up of solder in the soldered portion is good or not is determined based on the result of this measurement.

Description

焊料之沾附狀態的檢查方法及使用該方法之自動外觀檢查裝置、和基板檢查系統 Method for inspecting adhesion state of solder, automatic visual inspection device using the same, and substrate inspection system

本發明係有關用於對形成在組件安裝基板上之組件安裝位置之焊料沾附狀態進行檢查的檢查方法、使用該方法之自動外觀檢查裝置以及基板檢查系統。 The present invention relates to an inspection method for inspecting a solder adhesion state of a component mounting position formed on a component mounting substrate, an automatic visual inspection device using the same, and a substrate inspection system.

對於組件安裝基板之檢查,大多是以隨著藉攝影機進行拍攝之外觀檢查方式來實施。以往一般型的自動外觀檢查裝置配置有攝影機及照明裝置,該攝影機係以使光軸對準鉛直方向從正面觀察基板面的狀態,設定在支持基板之平台部的上方;照明裝置則將光線從各方位照射到該攝影機之視野,利用來自焊接部位對於照明光的的正反射光來產生影像。 Most of the inspection of the component mounting substrate is carried out by means of visual inspection by taking a picture with a camera. In the conventional automatic visual inspection device, a camera and an illumination device are disposed. The camera is placed above the platform portion of the support substrate in a state in which the optical axis is aligned in the vertical direction from the front, and the illumination device removes light from the illumination device. Each orientation is incident on the field of view of the camera, and the image is generated using specular reflected light from the soldered portion to the illumination light.

以這種自動外觀檢查裝置而言,有一種類型的檢查裝置係將複數種色彩光分別從對於基板之仰角各不相同的方向進行照射,並根據影像中顯現在焊接部位之色彩分布形態,來辨別固角焊料(solder fillet)之傾斜狀態適當與否(例如參照專利文獻1)。 In such an automatic visual inspection device, there is a type of inspection device that illuminates a plurality of color lights in different directions from the elevation angle of the substrate, and according to the color distribution pattern appearing at the welded portion in the image. It is discriminated whether the tilt state of the solid fillet is appropriate or not (for example, refer to Patent Document 1).

此外,亦有人提案從斜方向拍攝固角焊料之結構的檢查裝置。例如專利文獻2就記載了一邊對導腳組件的焊接部位進行照明,一邊從斜上方拍攝焊接部位,且從複數個方位拍攝1個檢查對象部位,利用將藉各拍攝所生成之影像中的明亮區域形態和分別對應之閥值比較的方法,以判定焊接的良否。 In addition, an inspection apparatus for photographing the structure of the solid angle solder from an oblique direction has also been proposed. For example, in the case of illuminating the welded portion of the guide pin assembly, the welded portion is photographed from obliquely above, and one inspection target portion is photographed from a plurality of orientations, and the brightness of the image generated by each shot is used. The method of comparing the regional morphology with the corresponding threshold value to determine the quality of the welding.

而且,近年來,在為了生產基板而實施的一連串工序的各個工序設置檢查裝置,將前面的工序檢查時所實施的量測結果利用在後續工序之檢查的檢查系統亦已開發出來。作為此種系統的一個例子,專利文獻3揭示了在焊料印刷工序、組件安裝工序、迴焊工序中配設了分別具有3維量測功能的檢查裝置,且各檢查裝置間構成為可進行通訊的系統。而且,專利文獻3亦記載了在各檢查裝置中,分別將前一個工序之檢查時所導出之量測數據輸入,並使用該量測數據,求得自身裝置之工序中所附加之部位、或產生變化之部位中的高度變化量,利用將該變化量和基準值比較的方法進行檢查。 In addition, in recent years, an inspection apparatus has been installed in each step of a series of processes performed to produce a substrate, and an inspection system that uses the measurement results performed in the previous process inspection for inspection in subsequent processes has also been developed. As an example of such a system, Patent Document 3 discloses that inspection apparatuses each having a three-dimensional measurement function are disposed in a solder printing process, a component mounting process, and a reflow process, and each inspection device is configured to be communicable system. Further, Patent Document 3 also describes that each of the inspection apparatuses inputs measurement data derived from the inspection of the previous process, and uses the measurement data to obtain a portion added to the process of the own device, or The amount of change in height in the portion where the change occurs is checked by a method of comparing the amount of change with the reference value.

具體而言,專利文獻3所記載之組件安裝後的檢查中,係量測膏狀焊料之高度,同時取得用焊料印刷工序之檢查裝置所量測之膏狀焊料的高度數據,藉由從雙方的量測數據求得膏狀焊料之高度變化量,來辨別組件安裝時之壓入量的適當與否。而且,焊料印刷後之檢查裝置中,在量測組件高度的同時,亦取得組件安裝工序之檢查裝置所量測之組件高度數據,藉由從雙方之量測數據求得組件高度之變化量,以辨別組件有無產生浮起不良的情形。 Specifically, in the inspection after the component mounting described in Patent Document 3, the height of the cream solder is measured, and the height data of the cream solder measured by the inspection device of the solder printing process is obtained. The measured data is used to determine the amount of change in the height of the cream solder to determine the appropriateness of the amount of pressing of the component during installation. Further, in the inspection device after the solder printing, the height of the component is measured, and the height data of the component measured by the inspection device of the component mounting process is also obtained, and the amount of change in the height of the component is obtained by measuring the data from both sides. In order to discern whether the component has a bad floating condition.

先前技術文獻 Prior technical literature 專利文獻 Patent literature

專利文獻1 日本特許第3599023號公報 Patent Document 1 Japanese Patent No. 3590032

專利文獻2 日本特開2004-151010號公報 Patent Document 2 Japanese Patent Laid-Open Publication No. 2004-151010

專利文獻3 日本特開2007-78533號公報 Patent Document 3 Japanese Patent Laid-Open Publication No. 2007-78533

從正面觀察基板面進行拍攝之類型的檢查裝置,固角焊料的傾斜角度很陡峻時,要使來自固角料(fillet)的正反射光成像在攝影機的拍攝面很困難,影像中的對應位置會成為暗黑區域。特別是,對於極小連接盤(land)的焊接部位,固角料(fillet)會變得非常陡峻,幾乎大部分固角料會在影像中形成暗黑區域,要辨別沾附狀態甚為困難。 When the angle of the solid angle solder is steep, it is difficult to image the specular reflection from the fillet on the imaging surface of the camera, and the corresponding position in the image. Will become a dark area. In particular, for very small joints of the land, the fillet becomes very steep, and almost all of the solid corners form dark areas in the image, making it difficult to discern the state of adhesion.

另一方面,若依專利文獻2所記載之從斜方向拍攝固角料的方法,可認為不論傾斜狀態如何,皆可對沾附之終點附近進行拍攝。但,實際的影像中,要區別組件之側面和固角料的交界很難,無法輕易確定焊料之沾附位置的情況甚多。而且,近年來基板安裝密度很高,從斜方向拍攝時,會有隱匿於其他組件之蹤影後等而使拍攝困難的組件,要將全部組件從適於固角料量測的方向拍攝,並不可能。 On the other hand, according to the method of photographing the solid corner material from the oblique direction described in Patent Document 2, it is considered that the vicinity of the end point of the adhesion can be imaged regardless of the tilt state. However, in the actual image, it is difficult to distinguish the side of the component from the solid corner, and it is not easy to determine the location of the solder. Moreover, in recent years, the mounting density of the substrate is high, and when photographing from an oblique direction, there is a component that is hidden in the trace of other components and is difficult to photograph, and all components are photographed from a direction suitable for measurement of the solid angle material, and impossible.

而且,導腳組件中,後面固角料(back fillet)充分沾附雖為決定焊接良否的重要因素,但後面固角料 會因組件電極或前面固角料(front fillet)而受到隱蔽,故拍攝困難,無法直接量測其特徵。 Moreover, in the guide element assembly, the back fillet is fully adhered, although it is an important factor in determining the quality of the weld, but the rear solid corner material It will be concealed due to the component electrodes or the front fillet, so it is difficult to take pictures directly.

本發明係著眼於上述的問題,而以能夠辨別包含外觀量測困難之部位在內之焊接部位中的焊料沾附狀態為課題。 The present invention has been made in view of the above problems, and it has been a problem to be able to discriminate a state of solder adhesion in a welded portion including a portion having difficulty in appearance measurement.

本發明之檢查方法係使用自動外觀檢查裝置來檢查基板中之焊料沾附狀態,該自動外觀檢查裝置具有:拍攝部,以從正面觀察組件安裝基板之基板面的狀態,配設於該基板之上方;及照明部,對拍攝部之拍攝對象區域進行照明。該方法中,係預先在為了生產組件安裝基板而實施之一連串工序中之焊料印刷工序中,將塗佈於該基板上之連接盤的膏狀焊料量,在組件安裝之前,按每個連接盤進行量測。並且,自動外觀檢查裝置中,具有藉拍攝部所生成之影像中未顯現之特徵,針對對應之連接盤所量測之膏狀焊料量符合預先決定之良好條件的焊接部位,執行以下的量測步驟及判定步驟。 In the inspection method of the present invention, the state of solder adhesion in the substrate is inspected by using an automatic visual inspection device having an imaging unit that is disposed on the substrate surface of the component mounting substrate from the front side. The upper part and the illumination part illuminate the subject area of the imaging unit. In this method, the amount of cream solder applied to the lands on the substrate in a solder printing process in a series of steps for mounting the substrate for the production of the component is performed before each component is mounted. Make measurements. Further, the automatic visual inspection device has the feature that is not displayed in the image generated by the imaging unit, and performs the following measurement on the welded portion in which the amount of the cream solder measured by the corresponding lands is in accordance with a predetermined good condition. Steps and decision steps.

量測步驟中,係將屬於顯現在藉拍攝部所生成之影像中的特徵,且為和檢查對象之焊接部位之影像中未顯現之位置的形狀有關係的特徵加以量測。判定步驟中,係根據藉量測步驟所得之量測結果,來判定具有未顯現在影像中之特徵的焊接部位的焊料沾附良否。 In the measurement step, the features appearing in the image generated by the imaging unit are measured, and the features related to the shape of the position not shown in the image of the welded portion of the inspection object are measured. In the determining step, based on the measurement result obtained by the borrowing measurement step, it is determined whether or not the solder adhesion of the welded portion having the feature not appearing in the image is good or not.

若依上述之方法,固角焊料形成之前的膏狀焊料量雖良好,但因某些因素而產生焊料之沾附不良,即使為無法從影像直接確認此不良時,亦可使用顯現在該影像中之其他部位的特徵來檢測出不良。 According to the above method, although the amount of the cream solder before the formation of the solid angle solder is good, the adhesion of the solder is poor due to some factors, and even if the defect cannot be directly confirmed from the image, it can be used in the image. Characteristics of other parts in the middle to detect defects.

具體而言,對於像晶片組件那樣側面設有電極之形狀的組件,對其焊接部位使用上述方法時,就可對對應連接盤中的膏狀焊料量的量測值超過預先決定的基準值的焊接部位,執行上述各步驟。此情況下的量測步驟中,係量測對象組件之高度。此外,在判定步驟中,量測步驟所得之組件高度的量測值與就該組件記錄之基準高度之差未超過預先決定之容許值時,即判定為檢查對象之焊接部位的焊料沾附良好;高度之差超過容許值時,則判定為檢查對象之焊接部位的焊料沾附不良。 Specifically, for the assembly having the shape of the electrode on the side like the wafer assembly, when the above method is used for the welded portion, the measured value of the amount of the cream solder in the corresponding lands can exceed a predetermined reference value. The welded parts are subjected to the above steps. In the measurement step in this case, the height of the object component is measured. Further, in the determining step, when the difference between the measured value of the component height obtained by the measuring step and the reference height recorded for the component does not exceed the predetermined allowable value, it is determined that the solder of the welded portion of the inspection object is well adhered. When the difference in height exceeds the allowable value, it is determined that the soldering portion of the inspection target has poor solder adhesion.

上述中,組件高度量測值與基準高度之差為表示組件浮起的參數。組件之浮起,是因在迴焊工序中,膏狀焊料熔融時,熔融之焊料流入組件下方所產生,若其流入量較大時,則連結組件電極與連接盤的焊料量變少,故焊料之沾附狀態亦變差。 In the above, the difference between the component height measurement value and the reference height is a parameter indicating that the component floats. The floating of the component is caused by the molten solder flowing into the lower part of the assembly when the cream solder is melted in the reflow process. If the inflow amount is large, the amount of solder connecting the electrode of the module and the land is less, so the solder The state of adhesion has also deteriorated.

本發明中,係按照此現象,在膏狀焊料之量超過基準值,組件之浮起量未超過容許值時,判定為焊料之沾附良好;膏狀焊料量雖超過基準值,組件之浮起量超過容許值時,判定為焊料之沾附不良。 In the present invention, according to this phenomenon, when the amount of the cream solder exceeds the reference value and the floating amount of the component does not exceed the allowable value, it is determined that the solder adheres well; although the amount of the cream solder exceeds the reference value, the float of the component When the amount of the amount exceeds the allowable value, it is determined that the solder is poorly adhered.

若依該方法,即使檢查對象之焊接部位成為暗黑區域,亦可正確區別該暗黑是否因固角料之傾斜陡峻而產生、或因固角料之形狀不良而產生。 According to this method, even if the welded portion of the inspection object becomes a dark region, it is possible to correctly distinguish whether the darkness is caused by the steepness of the solid angle or the shape of the solid corner.

還有,自動外觀檢查裝置中,在判定步驟之前,亦可先執行將和檢查對象之焊接部位對應的連接盤中膏狀焊料量之量測值從外部輸入的輸入步驟。此時,判定步驟中,可藉由按照輸入步驟所輸入之量測值使容許值之值改變,以提高判定的精確度。 Further, in the automatic visual inspection device, before the determination step, the input step of inputting the measurement value of the amount of the cream solder in the lands corresponding to the welded portion of the inspection target from the outside may be performed. At this time, in the determining step, the value of the allowable value can be changed by the measured value input in accordance with the input step, thereby improving the accuracy of the determination.

其次,對於要安裝在基板之導腳組件的各個電極焊接部位,使用上述方法時,係對膏狀焊料量之量測值超出預先決定之基準值的焊接部位,執行上述各步驟。此情況之量測步驟中,係將檢查對象之焊接部位的前面固角料影像施以處理,以量測用於形成該前面固角料之焊料量。又,判定步驟中,以量測步驟所得之量測值包含於預先決定的基準之範圍時,判定為檢查對象之焊接部位的焊料沾附良好;量測值不包含於基準範圍內時,判定為檢查對象之焊接部位的焊料沾附不良。 Next, when the above method is used for each electrode welding portion to be mounted on the lead member of the substrate, the above steps are performed for the welded portion whose measured amount of the cream solder exceeds a predetermined reference value. In the measuring step of this case, the front solid image of the welded portion of the inspection object is subjected to a treatment to measure the amount of solder used to form the front solid corner. Further, in the determination step, when the measured value obtained by the measuring step is included in the range of the predetermined reference, it is determined that the soldering portion of the welded portion to be inspected is well adhered; when the measured value is not included in the reference range, the determination is made. Poor solder adhesion to the soldered portion of the inspection object.

以往之對導腳組件的外觀檢查中,係僅以前面固角料作為量測對象,前面固角料形成良好,且塗佈於連接盤之膏狀焊料即使為適量,若其大部分偏向凝固於電極表面側,後面固角料就會變成不良。相反地,若膏狀焊料之大部分偏向凝固於電極背面側時,前面固角料就變成不良。 In the past, in the visual inspection of the guide pin assembly, only the front solid corner material was used as the measurement object, the front solid corner material was formed well, and the cream solder applied to the lands was even if it was an appropriate amount, and most of it was solidified. On the electrode surface side, the rear solid corners become poor. Conversely, if most of the cream solder is solidified on the back side of the electrode, the front solid material becomes defective.

本發明中,係按照此等現象,在膏狀焊料量超過基準值,而形成前面固角料之焊料量超過基準範圍或低於基準範圍時,判定為焊料之沾附不良。藉由此種方式,即可加入從影像難以確認的後面固角料狀態的判定,而提高檢查之精確度。 In the present invention, when the amount of the cream solder exceeds the reference value and the amount of the solder forming the front solid material exceeds the reference range or falls below the reference range, it is determined that the adhesion of the solder is poor. In this way, the determination of the state of the back solid material which is difficult to confirm from the image can be added, and the accuracy of the inspection can be improved.

以導腳組件為對象之檢查中,在判定步驟之前執行將和檢查對象之焊接部位對應之連接盤中的膏狀焊料量的量測值從外部輸入的輸入步驟,即可在判定步驟中因應輸入步驟所輸入之量測值而使基準範圍改變。若依此方式,即可因應塗佈於連接盤之焊料量使判定良否的基準改變,而提高判定的精確度。 In the inspection for the guide member, the input step of inputting the measurement value of the amount of the cream solder in the lands corresponding to the welded portion of the inspection object is performed before the determination step, and the reaction step can be performed in the determination step. Enter the measured value entered in the step to change the reference range. According to this method, the accuracy of the determination can be improved by changing the reference for determining the quality of the solder applied to the lands.

此外,膏狀焊料量之量測雖可在例如檢查焊料印刷狀態之檢查裝置進行,但並不限定於此,亦在可組件安裝工序中,在將組件安裝於導入該工序之基板之前,進行膏狀焊料之量測。 Further, the measurement of the amount of the cream solder can be performed, for example, in an inspection apparatus for inspecting the state of solder printing, but is not limited thereto, and in the component mounting process, before the component is mounted on the substrate introduced into the process, Measurement of cream solder.

還有,作為膏狀焊料量之量測方法,可藉由例如使用光切斷法或相位偏移法,求得塗佈於連接盤之膏狀焊料的高度,並藉由累計高度之方法,求得膏狀焊料之體積。但,並不限定於此,亦可利用影像之2值化等,檢測出膏狀焊料之塗佈區域,且對所檢測出之區域的面積(像素數)乘以用於焊料印刷之遮罩厚度的方法,求得表示膏狀焊料體積的數值。此外,也可將焊料塗佈區域之面積作為表示焊料量的參數。 Further, as a method of measuring the amount of the cream solder, the height of the cream solder applied to the land can be determined by, for example, a light cutting method or a phase shift method, and the method of accumulating the height can be used. Find the volume of the cream solder. However, the present invention is not limited thereto, and the application area of the cream solder may be detected by binarization of the image, and the area (number of pixels) of the detected area may be multiplied by the mask for solder printing. The method of thickness is used to obtain a value indicating the volume of the cream solder. Further, the area of the solder application region may be used as a parameter indicating the amount of solder.

自動外觀檢查裝置中的量測步驟,雖可利用相位差偏移法或立體量測等,以求得量測對象部位之3維數據,但量測之方法並不應限定於3維量測。 The measurement step in the automatic visual inspection device may use the phase difference migration method or the stereo measurement to obtain the three-dimensional data of the measurement target portion, but the measurement method is not limited to the three-dimensional measurement. .

本發明之自動外觀檢查裝置具備:拍攝部,以從正面觀察組件安裝基板之基板面的狀態,配設於該基板之上方;照明部,對拍攝部之拍攝區域進行照明;及處理部,使用藉拍攝部所生成之影像,來檢查基板上之焊料沾附狀態。 The automatic visual inspection device according to the present invention includes an imaging unit that is disposed above the substrate in a state in which the substrate surface of the component mounting substrate is viewed from the front, an illumination unit that illuminates an imaging region of the imaging unit, and a processing unit that uses The solder adhesion state on the substrate is checked by the image generated by the imaging unit.

處理部具有:量測手段,對於具有藉拍攝部所生成之影像中未顯現之特徵的焊接部位,將屬於影像中顯現之特徵,且為和該焊接部位中之未顯現於影像之位置的形狀有關係的特徵進行量測;判定手段,使用藉量測手段之處理所得之量測數據,來判定具有影像中未顯現之 特徵的焊接部位的焊料沾附良否;及輸出手段,將依據判定結果之檢查結果資訊予以輸出。 The processing unit includes: a measuring means for a soldering portion having a feature that is not displayed in the image generated by the image capturing portion, and a feature that appears in the image and a shape that is not present in the image of the soldering portion The characteristic of the relationship is measured; the determining means uses the measurement data obtained by the method of the borrowing measurement to determine that the image has not appeared. The solder joint of the characteristic soldering portion is good or not; and the output means outputs the inspection result information according to the determination result.

藉由上述構成,可以提供符合前述檢查方法之執行要件的自動外觀檢查裝置。若依該裝置,可以對包含影像中未顯現特徵之位置的判定在內的焊料沾附狀態進行良否之判定,使檢查之精確度得以大幅提升。 According to the above configuration, it is possible to provide an automatic visual inspection device that meets the execution requirements of the aforementioned inspection method. According to the device, it is possible to determine whether or not the solder adhering state including the position of the unapplied feature in the image is judged, and the accuracy of the inspection is greatly improved.

上述自動外觀檢查裝置之一實施形態,係具備輸入手段,該輸入手段係將表示和檢查對象之焊接部位對應的連接盤上所塗佈的膏狀焊料的量測值或該量測值之適當與否的判定結果資訊從外部輸入。又,判定手段係根據從輸入手段輸入之資訊,來辨別針對和檢查對象之焊接部位對應的連接盤所量測到的膏狀焊料量是否符合預定之良好條件。另一方面,辨別為符合條件時,就使用量測數據進行判定;辨別為不符合條件時,即判定為檢查對象之焊接部位的焊料沾附狀態不良。 In one embodiment of the automatic visual inspection device, there is provided an input means for appropriately measuring a measured value of the cream solder applied to the lands corresponding to the welded portion of the inspection target or the measured value. The result of the judgment result is input from the outside. Further, the determination means determines whether or not the amount of the cream solder measured by the land corresponding to the welded portion of the inspection target meets a predetermined good condition based on the information input from the input means. On the other hand, when it is determined that the condition is met, the measurement data is used for the determination, and when it is determined that the condition is not met, the solder adhesion state of the welded portion to be inspected is determined to be defective.

若依上述實施形態,即使在前面工序中不將具有膏狀焊料塗佈量非良好之連接盤的基板取下而使生產線運轉,也可對塗佈量並非良好之連接盤的焊接部位判定為不良。 According to the above-described embodiment, even if the substrate having the lands having the cream solder coating amount is not removed and the production line is operated in the previous step, the welded portion of the lands in which the coating amount is not good can be determined as bad.

本發明之基板檢查系統,係包含:第1自動外觀檢查裝置,設於為了生產組件安裝基板而實施之一連串工序中的焊料印刷工序中,用於檢查焊料印刷後之基板的各連接盤中膏狀焊料的塗佈狀態;及第2自動外觀檢查裝置,設於一連串工序中之迴焊工序,用於檢查經該迴焊工序之組件安裝基板的焊料沾附狀態。各自動外觀 檢查裝置具備:拍攝部,以從正面觀察檢查對象基板之基板面的狀態配設於該基板的上方;照明部,對拍攝部之拍攝對象區域進行照明;及處理部,使用藉拍攝部所生成之影像來執行檢查。 In the substrate inspection system of the present invention, the first automatic visual inspection device is provided in a solder printing process in a series of steps for producing a component mounting substrate, and is used for inspecting each of the lands of the substrate after solder printing. The second automatic visual inspection device is provided in a reflow process in a series of processes for inspecting the solder adhesion state of the component mounting substrate in the reflow process. Automatic appearance The inspection device includes an imaging unit that is disposed above the substrate in a state in which the substrate surface of the inspection target substrate is viewed from the front, an illumination unit that illuminates the imaging target region of the imaging unit, and a processing unit that is generated by using the imaging unit The image is used to perform the inspection.

第1自動外觀檢查裝置之處理部具備:量測手段,對塗佈於檢查對象之連接盤的膏狀焊料量進行量測;判定手段,將所量測之膏狀焊料量和預先記錄之基準值比較,以判定該膏狀焊料量之適當與否;及輸出手段,將根據該判定結果之檢查結果資訊予以輸出。 The processing unit of the first automatic visual inspection device includes a measuring means for measuring the amount of cream solder applied to the lands to be inspected, and a determining means for measuring the amount of the cream solder and the basis of the pre-recording The value is compared to determine whether the amount of the cream solder is appropriate or not; and the output means outputs the inspection result information based on the determination result.

第2自動外觀檢查裝置之處理部具備:輸入手段,將對於具有藉拍攝部所生成之影像中未顯現之特徵的焊接部位的對應連接盤的檢查結果資訊,藉由和第1自動外觀檢查裝置或接收第1自動外觀檢查裝置之輸出手段輸出的裝置間進行的通訊進行輸入;量測手段,對於具有影像中未顯現之特徵的焊接部位,將屬於影像中顯現之特徵,且為和該焊接部位之影像中未顯現之位置的形狀有關係的特徵進行量測;判定手段,根據藉輸入手段輸入之資訊,就和具有影像中未顯現特徵之焊接部位對應的連接盤所量測之膏狀焊料量是否符合預先決定之良好條件加以辨別,並使用該辨別結果與量測手段量測所得之量測數據,判定具有影像中未顯現之特徵的焊接部位的焊料沾附狀態良否;及輸出手段,將依據判定結果之檢查結果資訊予以輸出。 The processing unit of the second automatic visual inspection device includes an input means for checking the result of the inspection of the corresponding land of the welded portion having the feature that is not displayed in the image generated by the image capturing unit, and the first automatic visual inspection device. Or inputting communication between devices that output the output means of the first automatic visual inspection device; and the measuring means for the welded portion having the features that are not displayed in the image will be the features appearing in the image, and the welding The feature of the shape of the position that is not displayed in the image of the part is measured; the determining means is based on the information input by the input means, and is measured by the lands corresponding to the welded part having the unappeared feature in the image. Whether the amount of solder is determined according to a predetermined good condition, and the measurement data measured by the discrimination result and the measuring means is used to determine whether the solder adhesion state of the soldering portion having the feature not shown in the image is good or not; and the output means , the information of the inspection result based on the judgment result will be output.

上述系統中,第2自動外觀檢查裝置可將第1自動外觀檢查裝置對具有影像中未顯現之特徵之焊接部 位的對應連接盤實施檢查的結果或量測數據予以輸入,藉該輸入資訊來辨別該連接盤中之膏狀焊料量是否符合良好條件。在此辨別為膏狀焊料量符合良好條件時,可根據量測手段量測所得之量測數據,來判定焊料沾附之良否。另一方面,藉量測手段之量測辨別為膏狀焊料量並非良好時,也可以該辨別來判定焊料沾附之狀態為不良。 In the above system, the second automatic visual inspection device can connect the first automatic visual inspection device to the welded portion having the features that are not displayed in the image. The result of the inspection of the corresponding lands of the bit or the measurement data is input, and the input information is used to discriminate whether the amount of the cream solder in the lands is in good condition. When it is discriminated that the amount of the cream solder is in good condition, the measured data can be measured according to the measuring means to determine whether the solder is adhered or not. On the other hand, when the measurement by the measurement means determines that the amount of the cream solder is not good, it is also possible to determine that the state of the solder adhesion is defective.

若依本發明,即使對於呈暗黑區域顯現於影像中、或包含因拍攝困難而無法直接量測之位置的焊接部位,也可提升以優異精確度檢查焊料沾附狀態時的精確度。 According to the present invention, even in the case of a soldered portion which appears in an image in a dark area or which is in a position which cannot be directly measured due to difficulty in photographing, the accuracy in checking the state of solder adhesion with excellent precision can be improved.

10‧‧‧焊料印刷檢查裝置 10‧‧‧Solid printing inspection device

11‧‧‧焊料印刷裝置 11‧‧‧Solder printing device

20‧‧‧安裝檢查裝置 20‧‧‧Installation inspection device

21‧‧‧安裝裝置 21‧‧‧Installation device

30‧‧‧迴焊後檢查裝置 30‧‧‧Reflow inspection device

31‧‧‧迴焊爐 31‧‧‧Reflow furnace

40‧‧‧數據管理用伺服器 40‧‧‧Data management server

100、300‧‧‧處理部 100, 300‧‧ ‧ Processing Department

101、301‧‧‧平台部 101, 301‧‧‧ Platform Department

102、302‧‧‧攝影機 102, 302‧‧‧ camera

103、303‧‧‧投影機 103, 303‧‧‧ projector

104、304‧‧‧檢查頭 104, 304‧‧‧Check head

105、305‧‧‧照明裝置 105, 305‧‧‧ Lighting devices

110、310‧‧‧CPU 110, 310‧‧‧ CPU

111、311‧‧‧記憶體 111, 311‧‧‧ memory

112、312‧‧‧檢查頭控制部 112, 312‧‧ ‧ Inspector Head Control

113、313‧‧‧拍攝處理部 113, 313‧‧ ‧Photo Processing Department

114、314‧‧‧投影機控制部 114, 314‧‧‧Projector Control Department

115、315‧‧‧平台控制部 115, 315‧‧‧ Platform Control Department

116、316‧‧‧量測處理部 116, 316‧‧‧Measurement Processing Department

117、317‧‧‧執行檢查部 117, 317‧‧‧Executive Inspection Department

118、318‧‧‧檢查數據記憶部 118, 318‧‧‧Check data memory

119、319‧‧‧通訊介面 119, 319‧‧‧ communication interface

120、320‧‧‧操作部 120, 320‧‧‧ Operation Department

121、321‧‧‧顯示部 121, 321‧‧‧ Display Department

305a、305b‧‧‧窗部 305a, 305b‧‧‧ Window Department

322‧‧‧照明控制部 322‧‧‧Lighting Control Department

第1圖為將基板檢查系統之構成與組件安裝基板生產線之整體構成對應顯示的說明圖。 Fig. 1 is an explanatory view showing a configuration of a substrate inspection system and an overall configuration of a component mounting substrate production line.

第2圖為顯示焊料印刷檢查裝置之構成的方塊圖。 Fig. 2 is a block diagram showing the configuration of a solder print inspection apparatus.

第3圖為顯示迴焊後檢查裝置之構成的方塊圖。 Figure 3 is a block diagram showing the construction of the post-reflow inspection device.

第4圖(1)~(2)為顯示連接盤寬度之不同對固角料形狀與照明光之反射方向之影響的圖。 Fig. 4 (1) to (2) are graphs showing the influence of the difference in the width of the land on the shape of the solid material and the direction of reflection of the illumination light.

第5圖為顯示判定固角料良否之程序的流程圖。 Figure 5 is a flow chart showing the procedure for determining the quality of the solid corners.

第6圖(1)~(3)為示意性顯示藉由第5圖之判定處理作情況區別之實例圖。 Fig. 6 (1) to (3) are diagrams schematically showing an example of the difference in the case of the determination processing of Fig. 5.

第7圖為顯示不適用第5圖之判定基準之實例的圖。 Fig. 7 is a view showing an example in which the determination criterion of Fig. 5 is not applied.

第8圖為顯示迴焊後檢查之整體程序的流程圖。 Figure 8 is a flow chart showing the overall procedure for post-reflow inspection.

第9圖為示意性顯示膏狀焊料量與組件浮起量之容許值的關係圖。 Fig. 9 is a view schematically showing the relationship between the amount of cream solder and the allowable value of the amount of floating of the module.

第10圖為顯示膏狀焊料量與組件浮起量之容許值之關係的曲線圖。 Fig. 10 is a graph showing the relationship between the amount of cream solder and the allowable value of the amount of floating of the component.

第11圖(1)~(3)為示意性顯示導腳組件中固角料之良與不良之例的圖。 Fig. 11 (1) to (3) are diagrams schematically showing an example of good and bad solid corners in the lead assembly.

第12圖為顯示判定導腳組件中固角料之良否之程序的流程圖。 Figure 12 is a flow chart showing the procedure for determining the goodness of the solid corner material in the lead assembly.

〔發明的實施形態〕 [Embodiment of the Invention]

第1圖係將一實施形態之基板檢查系統之構成和組件安裝基板之生產線的整體構成對應顯示的圖。 Fig. 1 is a view showing a configuration of a substrate inspection system according to an embodiment and an overall configuration of a production line of a component mounting substrate.

該實施例的生產線包含:焊料印刷工序、組件安裝工序、及迴焊工序。焊料印刷工序包含:用於將膏狀焊料塗佈於基板上之各連接盤(land)的焊料印刷裝置11、與檢查膏狀焊料之塗佈狀態的焊料印刷檢查裝置10。組件安裝工序設有:將組件安裝於焊料印刷後之基板的安裝裝置(mounter)21、與用於檢查組件之安裝狀態的安裝檢查裝置20。迴焊工序設有:用於將組件安裝後之基板上的膏狀焊料熔解的迴焊爐31、與用於檢查迴焊後之基板上之固角焊料或組件狀態的迴焊後檢查裝置30。 The production line of this embodiment includes a solder printing process, a component mounting process, and a reflow process. The solder printing process includes a solder printing apparatus 11 for applying a cream solder to each land on a substrate, and a solder print inspection apparatus 10 for inspecting a coated state of the cream solder. The component mounting process includes a mounter 21 for mounting the component on the substrate after solder printing, and a mount inspection device 20 for inspecting the mounted state of the component. The reflow process includes: a reflow furnace 31 for melting the cream solder on the substrate after the assembly is mounted, and a post-reflow inspection device 30 for checking the state of the solid angle solder or the component on the substrate after reflowing .

上述檢查裝置10、20、30皆為自動外觀檢查裝置,且透過LAN迴線100彼此連接。 Each of the inspection devices 10, 20, and 30 is an automatic visual inspection device and is connected to each other through a LAN return line 100.

再者,該LAN迴線100連接有數據管理用伺服器40。該伺服器40中儲存有用各檢查裝置10、20、30進行檢查 所使用的檢查基準數據與檢查結果資訊。檢查基準數據包含檢查所需之程式、與判定基準值等。檢查結果資訊包含根據對檢查對象部位進行量測處理所得之量測數據或良否之判定結果。 Further, the LAN management line 40 is connected to the LAN return line 100. The server 40 stores the inspection devices 10, 20, and 30 for inspection. The inspection reference data and inspection result information used. The inspection reference data includes the program required for inspection, the judgment reference value, and the like. The inspection result information includes the measurement result or the result of the determination based on the measurement processing of the inspection target portion.

各檢查裝置10、20、30中,係分別從伺服器40讀取所需之檢查基準數據,產生對象基板檢查用的檢查程式,並根據該程式對基板進行拍攝,按對應各個組件的每個範圍執行量測及判定。經該等處理所得之檢查結果資訊,係連繫彙整到基板及組件之識別資訊,並傳送到伺服器40,儲存於其記憶體內。 Each of the inspection apparatuses 10, 20, and 30 reads the required inspection reference data from the server 40, generates an inspection program for the target substrate inspection, and photographs the substrate according to the program, and presses each of the corresponding components. The range performs measurement and determination. The inspection result information obtained by the processing is connected to the identification information of the substrate and the component, and transmitted to the server 40 for storage in the memory.

此外,焊料印刷檢查裝置10之檢查結果資訊也可依每個連接盤讀取。迴焊後檢查裝置30之固角料檢查結果與量測數據也設定成可依各個電極讀取。 Further, the inspection result information of the solder print inspection apparatus 10 can also be read by each of the lands. The solid angle inspection result and the measurement data of the post-reflow inspection device 30 are also set to be readable by each electrode.

利用上述構成之檢查結果資訊,於該實施例中,在迴焊後檢查裝置30之固角料檢查中,係取得焊料印刷檢查裝置10對於作為和檢查對象之焊接部位對應的連接盤實施檢查而獲得的檢查結果資訊,並將該檢查結果資訊做為判定對象之一而進行檢查。該實施例中,係設成由迴焊後檢查裝置30對數據管理用伺服器40進行存取,以取得處理對象之連接盤的檢查結果資訊。但並不限定於此種方式,也可設成利用和焊料印刷檢查裝置10之通訊,取得必要的檢查結果資訊。 According to the inspection result information of the above-described configuration, in the solid corner inspection of the post-reflow inspection apparatus 30, the solder print inspection apparatus 10 obtains the inspection of the land corresponding to the welding portion to be inspected. The obtained inspection result information is checked and the inspection result information is one of the determination targets. In this embodiment, the data management server 40 is accessed by the post-reflow inspection device 30 to obtain inspection result information of the platter to be processed. However, the present invention is not limited to this type, and communication with the solder print inspection apparatus 10 may be used to obtain necessary inspection result information.

以下就有關該檢查之裝置構成與處理的內容循序加以說明。 The contents of the device configuration and processing relating to the inspection will be described below in order.

第2圖係顯示焊料印刷檢查裝置10之構成。 Fig. 2 shows the configuration of the solder print inspection apparatus 10.

該實施例之焊料印刷檢查裝置10設有:用於支持作為檢查對象之基板的平台部101;攝影機102、投影機103以及將該等配備支持於平台部101之上方的檢查頭104;及處理部100。平台部101設有使該平台本體沿著一軸(例如第2圖中沿左右方向之軸)移動的移動機構(未圖示)。檢查頭104設有使該檢查頭本體和攝影機102及投影機103一起沿著與平台部101之移動軸正交之軸移動的移動機構(未圖示)。此外,檢查頭104亦安裝有用於對攝影機102之拍攝對象區域進行照明的照明部,但未顯示於第2圖。 The solder print inspection apparatus 10 of this embodiment is provided with a platform portion 101 for supporting a substrate to be inspected, a camera 102, a projector 103, and an inspection head 104 that is supported above the platform portion 101; and processing Department 100. The platform unit 101 is provided with a moving mechanism (not shown) that moves the platform body along an axis (for example, an axis in the left-right direction in FIG. 2). The inspection head 104 is provided with a moving mechanism (not shown) that moves the inspection head main body together with the camera 102 and the projector 103 along an axis orthogonal to the movement axis of the platform unit 101. Further, the inspection head 104 is also provided with an illumination unit for illuminating the imaging target area of the camera 102, but is not shown in FIG.

除了上述移動機構與光學系統之動作控制之外,處理部100也執行量測、判定、及結果之輸出等處理,故亦包含CPU110、記憶體111、檢查頭控制部112、拍攝處理部113、投影機控制部114、平台控制部115、量測處理部116、執行檢查部117、檢查數據記憶部118、通訊介面119、操作部120、顯示部121等。 In addition to the above-described operation control of the moving mechanism and the optical system, the processing unit 100 also performs processing such as measurement, determination, and output of results, and thus includes the CPU 110, the memory 111, the inspection head control unit 112, the imaging processing unit 113, and The projector control unit 114, the platform control unit 115, the measurement processing unit 116, the execution inspection unit 117, the inspection data storage unit 118, the communication interface 119, the operation unit 120, the display unit 121, and the like.

CPU110係經由檢查頭控制部112與平台控制部115來控制檢查頭104與平台部101的移動,同時經由拍攝處理部113使攝影機102進行拍攝,且經由投影機控制部114使投影機103進行投影處理。而且,拍攝處理部113亦設有將藉由攝影機102所生成的影像輸入並作數位轉換的功能。 The CPU 110 controls the movement of the inspection head 104 and the platform unit 101 via the inspection head control unit 112 and the platform control unit 115, and causes the camera 102 to perform imaging via the imaging processing unit 113, and causes the projector 103 to project via the projector control unit 114. deal with. Further, the imaging processing unit 113 is also provided with a function of inputting a video generated by the camera 102 and performing digital conversion.

記憶體111中,除了可儲存有關上述控制之程式外,還儲存有藉拍攝處理部113之數位轉換所生成之影像數據與要讓投影機103投影的投影影像等。 The memory 111 stores, in addition to the program for the above control, image data generated by the digital conversion by the image processing unit 113, a projection image to be projected by the projector 103, and the like.

量測處理部116及執行檢查部117為可程式化邏輯裝置,和CPU110配合執行量測與判定處理。 The measurement processing unit 116 and the execution inspection unit 117 are programmable logic devices, and cooperate with the CPU 110 to perform measurement and determination processing.

具有上述構成的焊料印刷檢查裝置10中,係根據相位偏移法之原理,對基板上的連接盤,從投影機103將周期性變動之條紋狀圖案影像進行投影,同時在圖案影像每有變化時進行拍攝。量測處理部116係按每個像素檢測一週期份之投影處理期間所生的影像亮度變化,並根據其變化相位計算出該像素所顯示之點的高度。 In the solder print inspection apparatus 10 having the above configuration, according to the principle of the phase shift method, the lands on the substrate are projected from the projector 103 by the stripe pattern image which periodically changes, and the pattern image changes every time. Take a picture. The measurement processing unit 116 detects a change in image brightness generated during a projection process of one cycle for each pixel, and calculates a height of a dot displayed by the pixel based on the phase of the change.

再者,量測處理部116係將所算出之高度超過預定值的像素視為膏狀焊料的顯示,並利用將該等像素之高度進行累計,來求得連接盤上之膏狀焊料的體積。執行檢查部117則將上述體積和預先記錄的基準值對照,若體積在基準值以上,就判定為膏狀焊料之塗佈量良好,如體積未達基準值時,則判定為膏狀焊料之塗佈量不良。 Further, the measurement processing unit 116 regards the pixel whose calculated height exceeds a predetermined value as the display of the cream solder, and integrates the heights of the pixels to obtain the volume of the cream solder on the land. . The execution inspection unit 117 compares the volume with a predetermined reference value. When the volume is equal to or greater than the reference value, it is determined that the coating amount of the cream solder is good. If the volume is less than the reference value, the cream is determined to be a cream solder. Poor coating amount.

CPU110係將上述判定結果與用於判定之焊料體積的量測值彙整為依從前述數據構成的檢查結果資訊,並儲存於檢查數據記憶部118。而且,每當1片基板的檢查結束時,就將針對該基板所儲存的資訊進行彙整,並經由通訊介面119傳送到伺服器40。 The CPU 110 integrates the determination result and the measurement value for determining the solder volume into inspection result information constituting the data, and stores it in the inspection data storage unit 118. Further, each time the inspection of one substrate is completed, the information stored for the substrate is collected and transmitted to the server 40 via the communication interface 119.

第3圖為顯示迴焊後檢查裝置30之構成。 Fig. 3 is a view showing the configuration of the post-reflow inspection device 30.

該迴焊後檢查裝置30亦具有:基板平台301;攝影機302及投影機303與檢查頭304;以及處理部300。處理部300亦具備和第2圖之焊料印刷檢查裝置10的處理部100同樣的構成,故對各構成標註後兩位數和焊料印刷檢查 裝置10的對應構成一致的符號(例如,對於CP U110,則標註為CPU310),且省略其說明。 The post-reflow inspection device 30 also has a substrate platform 301, a camera 302, a projector 303 and an inspection head 304, and a processing unit 300. The processing unit 300 also has the same configuration as the processing unit 100 of the solder print inspection device 10 of FIG. 2, so the post-digit two-digit number and the solder print check are attached to each configuration. The symbols corresponding to the configuration of the device 10 (for example, the CPU 310 for the CP U110) are omitted, and the description thereof is omitted.

以焊料印刷檢查裝置10未有的構成而言,迴焊後檢查裝置30設有天棚型(dome type)照明裝置305作為照明部。而且,處理部300內也設有用以控制照明裝置305之發光動作的照明控制部322。 In the configuration that is not present in the solder print inspection apparatus 10, the post-reflow inspection apparatus 30 is provided with a dome type illumination device 305 as an illumination unit. Further, the processing unit 300 is also provided with an illumination control unit 322 for controlling the lighting operation of the illumination device 305.

照明裝置305也安裝於檢查頭304,但係支持在比攝影機302或投影機303更低的位置。照明裝置305之對應天棚式攝影機302或投影機303的位置分別設有拍攝用、投影用的窗部305a、305b。窗部305a、305b之外的天棚內面大致整個區域,以圓環狀排列配設有LED(未圖示)。該等LED所發出之光色係按照方位角與入射角的變化而徐徐變化,並以各顏色之光擴散時會成為白色光的方式予以調整。 The illumination device 305 is also mounted to the inspection head 304, but is supported at a lower position than the camera 302 or projector 303. The position of the ceiling camera 302 or the projector 303 of the illumination device 305 is provided with window portions 305a and 305b for imaging and projection, respectively. LEDs (not shown) are arranged in an annular shape over substantially the entire inner surface of the ceiling outside the window portions 305a and 305b. The color of the light emitted by the LEDs changes slowly according to the change in the azimuth angle and the incident angle, and is adjusted so as to become white light when the light of each color diffuses.

上述構成之迴焊後檢查裝置30中,和焊料印刷檢查裝置10同樣的,係配合來自投影機303之條紋狀圖案影像的投影而進行複數次拍攝,且使用各次拍攝所生成之影像進行高度量測。該高度量測係針對和組件對應的範圍來實施,藉以使組件的三維形狀得以復原。 In the post-reflow inspection apparatus 30 having the above-described configuration, similarly to the solder print inspection apparatus 10, a plurality of shots are taken in accordance with the projection of the stripe pattern image from the projector 303, and the height of the image generated by each shot is used. Measure. This height measurement is implemented for a range corresponding to the component, whereby the three-dimensional shape of the component is restored.

而且,迴焊後檢查裝置30中,係在照明裝置305之照明(以下,稱為「天棚照明(dome illumination)」)下進行拍攝,根據顯現在影像中之焊接部位之正反射光像的色彩及對應該色彩之光的照射方向,以確定該色彩所生像素顯示的面法線方向。再進一步使用該經確定之像素的座標與法線向量的組合,使焊料的三維形狀復 原,藉由分析該三維形狀與組件之三維形狀的關係,以判定焊料是否良好地溼膨於組件之電極。 Further, in the post-reflow inspection device 30, the illumination is performed under the illumination of the illumination device 305 (hereinafter referred to as "dome illumination"), and the color of the specular reflection image of the welded portion appearing in the image is displayed. And the direction of illumination corresponding to the color of the light to determine the surface normal direction of the pixel produced by the color. Further using the combination of the coordinates of the determined pixel and the normal vector to make the three-dimensional shape of the solder Originally, by analyzing the relationship between the three-dimensional shape and the three-dimensional shape of the component, it is determined whether the solder is well wetted to the electrode of the module.

此外,量測處理部316包含有表格(table),該表格內記錄有表示色彩之特徵數據、與由該色彩之光所推算的法線方向之對應關係,依據由該影像檢測出的特徵數據來查閱該表格,即可迅速確定法線的方向。 Further, the measurement processing unit 316 includes a table in which characteristic data representing a color and a correspondence relationship with a normal direction estimated by the light of the color are recorded, and the feature data detected by the image is used. Check the form to quickly determine the direction of the normal.

惟,迴焊後檢查裝置30之攝影機302係以從大致正上方拍攝基板的方式配設,若固角焊料之傾斜陡峻,則來自固角料的正反射光會難以進入攝影機。 However, the camera 302 of the post-reflow inspection apparatus 30 is disposed so as to photograph the substrate from substantially right above. If the inclination of the solid angle solder is steep, it is difficult for the regular reflection light from the solid angle material to enter the camera.

第4圖係顯示以晶片組件為例,依焊接對象之連接盤的大小,使固角料之傾斜角度或照明光的反射方向有所改變的例子。此外,第4圖與後述第6、7、9圖中,係為了簡化,而僅顯示對晶片組件之單側電極焊接的狀態。 Fig. 4 shows an example in which the wafer assembly is used as an example to change the inclination angle of the solid angle material or the reflection direction of the illumination light depending on the size of the land to be welded. Further, in Fig. 4 and Figs. 6, 7, and 9 to be described later, only the state in which the one-side electrode of the wafer unit is welded is shown for simplification.

焊接於標準大小的連接盤時,如第4圖之(1)所示,固角料比較和緩,可以使來自斜方向的照明光朝攝影機302的方向反射。然而,焊接對象之連接盤的寬度狹窄時,固角料之傾斜亦變得陡峻,故如第4圖之(2)所示,不能使照明光朝攝影機302之方向反射。結果,影像中對應於固角料的位置就成為暗黑區域,無法使焊料三維形狀復原,不能實施精確度優異的檢查。 When soldering to a standard-sized lands, as shown in (1) of Fig. 4, the solid corners are relatively gentle, and the illumination light from the oblique direction can be reflected toward the direction of the camera 302. However, when the width of the land to be welded is narrow, the inclination of the solid material becomes steep, so that the illumination light cannot be reflected in the direction of the camera 302 as shown in (2) of Fig. 4 . As a result, the position corresponding to the solid corner material in the image becomes a dark area, and the three-dimensional shape of the solder cannot be restored, and the inspection with excellent accuracy cannot be performed.

有鑑於上述的問題,本實施例之迴焊後檢查中,對於色彩分布不明確的焊接部位,乃將對於該部位之對應連接盤的焊料印刷檢查之結果輸入,從自身裝置所量測之組件高度算出該組件的浮起量,並利用第5圖所示的處理,判定固角料的良否。 In view of the above problems, in the post-reflow inspection of the present embodiment, for the solder joint where the color distribution is not clear, the result of the solder print inspection for the corresponding land of the portion is input, and the component measured from the self device is input. The amount of floating of the component is calculated by the height, and the processing shown in Fig. 5 is used to determine whether the solid angle is good or not.

該判定處理中,係查核焊料印刷檢查之結果為「良」或「不良」(步驟A)。而且,若其結果為「良」,則查核組件之浮起量是否在容許值以內(步驟B)。 In this determination process, the result of checking the solder print inspection is "good" or "poor" (step A). Moreover, if the result is "good", it is checked whether the floating amount of the component is within the allowable value (step B).

第6圖係以晶片組件為例,利用上述步驟A、B做情況區分的3個實例。 Fig. 6 shows a three example of the case division using the wafer assembly as an example, using the above steps A and B.

各實例均將塗佈於組件安裝前之基板的膏狀焊料狀態,將藉該該膏狀焊料之熔融及固化所形成之固角料狀態作左右並排顯示。而且,右手邊的圖中,焊料對於組件電極之沾附範圍係利用帶箭號之線表示。 Each of the examples is applied to the cream state of the substrate before the component is mounted, and the state of the solid filler formed by the melting and solidification of the cream solder is displayed side by side. Moreover, in the figure on the right hand side, the adhesion range of the solder to the component electrodes is represented by a line with an arrow.

第6圖之(1)的例子中,連接盤上沾附了適量的膏狀焊料,而且組件亦正確裝設在連接盤上,焊料則沾附到電極上部。在此情況中,焊料印刷檢查的結果為「良」,組件之浮起量亦在容許值以內,故第4圖之步驟A、B均為「YES」,固角料被判定均為良好(步驟C)。 In the example of (1) of Fig. 6, the appropriate amount of cream solder is adhered to the land, and the assembly is properly mounted on the land, and the solder is adhered to the upper portion of the electrode. In this case, the result of the solder print inspection is "good", and the floating amount of the component is within the allowable value. Therefore, steps A and B of Fig. 4 are both "YES", and the solid corners are judged to be good ( Step C).

第6圖之(2)的例子中,膏狀焊料之量雖屬適當,但膏狀焊料熔融時,組件浮起,且焊料的一部分流入到該組件之下方,故對形成固角料有助益的焊料量大幅減少。焊料雖在某種程度上有所沾附,但因組件移動至上方,故沾附的上端位置就停留在組件電極的下端部。 In the example of (2) of Fig. 6, the amount of the cream solder is appropriate, but when the cream solder is melted, the assembly floats and a part of the solder flows under the assembly, thereby contributing to the formation of the solid corner material. The amount of solder is greatly reduced. Although the solder adheres to some extent, since the component moves to the upper side, the upper end position of the adhesion stays at the lower end of the component electrode.

在此情形中,焊料印刷檢查的結果雖為「良」,但組件之浮起量超過容許值,故步驟A為「YES」、步驟B為「NO」,故可判定為固角料不良(步驟D)。 In this case, although the result of the solder print inspection is "good", the floating amount of the component exceeds the allowable value, so that step A is "YES" and step B is "NO", so it can be determined that the solid corner material is defective ( Step D).

第6圖之(3)的例子中,因為對連接盤的膏狀焊料塗佈量少於基準量,故產生了焊料的沾附不良。在該情況中,因焊料印刷檢查之結果為「不良」,步驟A 即成為「NO」,故不查核組件之浮起量,而直接進到步驟D,判定發生了固角料不良。 In the example of (3) of Fig. 6, since the amount of the cream solder applied to the land is less than the reference amount, the adhesion of the solder is poor. In this case, the result of the solder print inspection is "poor", step A That is, if it is "NO", the amount of floating of the component is not checked, and the process proceeds directly to step D, and it is determined that the solid waste is defective.

如第6圖之(2)、(3)所示,膏狀焊料量較少的情形中、或發生組件浮起的情形中,焊料的沾附狀態不充分,固角料變得較短。但,連接盤較狹窄時,即使固角料之長度變短,其傾斜度也會變得陡峻,故即使在第6圖之(2)、(3)的實例中,和第6圖之(1)的實例同樣的,有可能在影像中不發生固角料的色彩分布。在此情形下,就難以從影像區別第6圖之(1)、(2)、(3)的各實例。 As shown in (2) and (3) of Fig. 6, in the case where the amount of the cream solder is small or the case where the module is floated, the adhesion state of the solder is insufficient, and the solid corner material becomes short. However, when the lands are narrow, even if the length of the gusset becomes short, the inclination becomes steep, so even in the examples of (2) and (3) of Fig. 6, and Fig. 6 ( The example of 1) is the same, it is possible that the color distribution of the solid corner does not occur in the image. In this case, it is difficult to distinguish the examples of (1), (2), and (3) of Fig. 6 from the image.

相對於此,若依第5圖所示之判定演譯法,可以依據組件安裝前之連接盤中的膏狀焊料塗佈量、與迴焊後基板中的組件浮起量的兩種參數來區別各實例,而正確判定固角料的良否。 On the other hand, according to the decision interpretation method shown in FIG. 5, it is possible to determine the amount of the cream solder applied in the lands before the component is mounted and the amount of the component float in the substrate after the reflow. Differentiate each instance and correctly determine whether the solid angle is good or not.

但,第5圖之判定處理之所以被使用,是因為相對於來自天棚型照明裝置305之光的正反射光無法導至攝影機302,故影像中之對應位置限定在成為暗黑區域的焊接部位。對於未產生暗黑區域的焊接部位,則使用先前所述之根據焊料之三維形狀與組件之三維形狀的關係進行判定的演譯法。藉由以此方式明確分開判定處理的演譯法,即可防止如第7圖所示形狀的焊料被判定為良好。 However, the determination process of Fig. 5 is used because the specular reflection light from the light from the ceiling type illumination device 305 cannot be guided to the camera 302, so that the corresponding position in the image is limited to the welded portion which becomes the dark region. For the welded portion where the dark region is not generated, the above-described interpretation method based on the relationship between the three-dimensional shape of the solder and the three-dimensional shape of the component is used. By clearly separating the interpretation processing of the processing in this manner, it is possible to prevent the solder having the shape shown in Fig. 7 from being judged to be good.

第7圖的實例中,膏狀焊料的焊料量屬於適當,也未發生組件的浮起,但由於某些原因(例如迴焊爐的温度較低),焊料不會溼膨,反而固結成為球塊狀。第5圖之判定處理使用於這類形狀的焊料時,會作出固角料 為良好的判定,故情況欠佳。但,第7圖之例的焊料,傾斜和緩,對於照明光的正反射光會被導至攝影機302,在天棚照明下之影像中的對應位置,會產生照明光所生的色彩分布,故可當作第5圖之判定處理的適用外狀況。 In the example of Fig. 7, the amount of solder of the cream solder is appropriate, and the floating of the component does not occur, but for some reasons (for example, the temperature of the reflow furnace is low), the solder does not wet and consolidate. Ball-shaped. When the determination process of Figure 5 is used for solder of this type, solid corners are made. For good judgment, the situation is not good. However, the solder of the example of Fig. 7 is inclined and gentle, and the specular reflected light for the illumination light is guided to the camera 302. The corresponding position in the image under the ceiling illumination produces a color distribution of the illumination light, so It is the applicable external condition of the judgment processing of the fifth figure.

因而,藉由從色彩分布復原的三維形狀,可正確判定固角料之形狀有不良。 Therefore, it is possible to accurately determine the shape of the solid corner material by the three-dimensional shape restored from the color distribution.

第8圖顯示在迴焊後檢查裝置30中執行之檢查的具體程序。 Fig. 8 shows a specific procedure of the inspection performed in the inspection device 30 after the reflow.

該項處理係使檢查對象基板移入平台部301,和檢查頭304對準位置完成後就可開始。首先,在步驟S1中,為了獲得組件高度量測用影像,乃在利用投影機303所提供之圖案影像之投影下執行預定次數的拍攝。在步驟S2中,為了獲得焊料量測用影像,亦在天棚照明下執行拍攝。 This processing allows the inspection target substrate to be moved into the platform portion 301, and the alignment of the inspection head 304 is completed. First, in step S1, in order to obtain the component height measurement image, a predetermined number of times of shooting is performed using the projection of the pattern image provided by the projector 303. In step S2, in order to obtain the image for solder measurement, shooting is also performed under ceiling lighting.

步驟S1、S2的各次拍攝所得之複數幀影像係儲存於記憶體311。各次拍攝係在將攝影機302定位於特定場所之狀態下進行,故該等影像所包含之組件位置或配置的關係全部都會進行整合。 The plurality of frame images obtained by each of the steps S1 and S2 are stored in the memory 311. Each of the photographing is performed while the camera 302 is positioned at a specific location, and thus the relationship of the position or arrangement of the components included in the images is integrated.

以下依序著眼於影像中所包含的組件,按每個組件執行以下的處理。 The following focuses on the components included in the image, and performs the following processing for each component.

首先,對著眼的組件設定檢查用窗(window)(步驟S3)。被設定之窗雖依組件種類而有不同,但一般係設定包含組件本體的組件窗、與每個焊接部位的連接盤窗(land window)。這些窗亦設定成共用於上述複數個影像的窗。 First, a window for inspection is set for the component in focus (step S3). The window to be set differs depending on the type of component, but generally, a component window including the component body and a land window for each soldering portion are set. These windows are also set to be common to the windows of the plurality of images described above.

步驟S4中,係以組件窗內之各像素作為對象,使用條紋狀圖案影像之投影下所生成的影像數據進行高度量測。再進一步藉將經量測得預定值以上高度之像素的座標、和經算出之高度加以組合,使組件之三維形狀復原。 In step S4, the height measurement is performed using the image data generated by the projection of the stripe pattern image as the object of each pixel in the component window. Further, by combining the coordinates of the pixels whose height is measured by a predetermined value or more and the calculated height, the three-dimensional shape of the module is restored.

步驟S5中,係以天棚照明下的影像為對象,將設定於著眼中之組件之連接盤窗內的暗黑區域進行檢測。步驟S6中,係求出每個連接盤窗中占據該窗之暗黑區域的比例,將其和預定的閥值比較。在此,如暗黑區域之比例超出閥值的連接盤窗即使為1個,亦執行步驟S7、S8、S9。 In step S5, the dark area in the connection window of the component set in the eye is detected for the image under the illumination of the ceiling. In step S6, the ratio of the dark areas occupying the window in each of the lands is determined and compared with a predetermined threshold. Here, if there is only one connection window in which the ratio of the dark area exceeds the threshold, steps S7, S8, and S9 are executed.

步驟S7中,係從數據管理用伺服器40或焊料印刷檢查裝置10,將對於著眼中之組件的焊料印刷檢查結果輸入。步驟S8中係根據步驟S4所量測之高度數據,算出該組件的浮起量。具體而言,係以對組件算出之高度的平均值或最大值作為組件高度,求出該高度和針對著眼中組件所記錄之基準高度的差,並以該差值為浮起量。 In step S7, the result of the solder print inspection for the component in the eye is input from the data management server 40 or the solder print inspection device 10. In step S8, the amount of floating of the component is calculated based on the height data measured in step S4. Specifically, the average value or the maximum value of the height calculated for the component is used as the component height, and the difference between the height and the reference height recorded for the component in the eye is obtained, and the difference is the floating amount.

步驟S9中,係用步驟S7輸入之焊料量和步驟S8算出之組件浮起量,藉由按每個連接盤窗執行先前第5圖所示之方法所為之判定處理,來判定各連接盤窗中固角料之良否。 In step S9, the amount of solder input in step S7 and the amount of component floating calculated in step S8 are determined, and each of the connection trays is determined by performing the determination processing for the method shown in the previous fifth diagram for each of the connection trays. Whether the medium solid angle is good or not.

步驟S6中,經判定各連接盤窗之暗黑區域的比例小於閥值時,就按每個連接盤窗執行步驟S10及步驟S11。 In step S6, when it is determined that the ratio of the dark areas of the respective connection trays is smaller than the threshold value, step S10 and step S11 are executed for each of the connection tray windows.

步驟S10中,係參照先前述的表格,利用將連接盤窗內之色彩分布置換為法線分布的方法,使焊料之三維形狀復原。 In step S10, the three-dimensional shape of the solder is restored by referring to the above-described table and replacing the color distribution in the connected disk window with the normal distribution.

步驟S11中,係使用前述步驟S10所復原之焊料三維形狀與步驟S4所復原之組件的三維形狀進行的分析處理,來判定固角焊料之良否。例如,從表示組件之座標與表示焊料之座標的關係,來判定焊料是否接觸組件之側面。判斷為有接觸時,將該接觸部分之兩者高度加以比較。然後,兩者高度之差如在預定的閥值以內,則判定為固角料良好,差值大於閥值時,則判定為固角料不良。 In step S11, the analysis of the three-dimensional shape of the solder restored in the above step S10 and the three-dimensional shape of the component restored in step S4 is performed to determine whether the solid angle solder is good or not. For example, it is determined whether the solder contacts the side of the component from the relationship between the coordinates of the component and the coordinates representing the solder. When it is judged that there is contact, the heights of the contact portions are compared. Then, if the difference between the heights is within a predetermined threshold, it is determined that the solid corner material is good, and when the difference is greater than the threshold value, it is determined that the solid corner material is defective.

按每個組件重複執行以上之處理的結果,在對全部組件之處理結束時(步驟S12為「YES」),將各組件的判定結果加以綜合,以判定基板整體的良否(步驟S13)。接著,步驟S14中,係製作包含各判定之結果與量測值的檢查結果資訊,並往檢查數據記憶部318儲存及往數據管理用伺服器40輸出。 The result of the above processing is repeated for each component, and when the processing for all the components is completed (YES in step S12), the determination results of the respective components are integrated to determine whether or not the entire substrate is good (step S13). Next, in step S14, the inspection result information including the result of each determination and the measurement value is created, and is stored in the inspection data storage unit 318 and output to the data management server 40.

此外,若依第8圖的流程圖,因為拍攝的緣故,平台部301與檢查頭304配合的處理係為1次,但基板較攝影機302之視野為大時,則重複進行步驟S1、S2的拍攝,並配合拍攝的循環而將步驟S3至S12重複進行。 Further, according to the flowchart of FIG. 8, the processing of the platform portion 301 and the inspection head 304 is performed once because of the photographing, but when the substrate has a larger field of view than the camera 302, the steps S1 and S2 are repeated. The shooting is repeated with steps S3 to S12 in conjunction with the cycle of shooting.

還有,在步驟S9(第5圖之步驟B),用來和組件之浮起量比較的容許值,經考量組件高度不均後,有預先設定的必要。例如,按每個組件種類,求得該種組件之高度不均的程度,將從該不均值導出的容許值作為檢查基準數據,並記錄下來。 Further, in step S9 (step B of Fig. 5), the allowable value for comparison with the amount of floating of the component is determined in advance by considering the height unevenness of the component. For example, the degree of height unevenness of such a component is obtained for each component type, and the allowable value derived from the unevenness value is used as inspection reference data, and is recorded.

組件之浮起容許值並非一定值,而是使之因應膏狀焊料的量(體積)而改變的話,則判定的精確度可以更為提高。 If the floating tolerance of the component is not a certain value, but is changed in accordance with the amount (volume) of the cream solder, the accuracy of the determination can be further improved.

第9圖係示意性顯示膏狀焊料的塗佈量與用以辨別造成固角料不良之浮起量容許值的關係。如該圖所示,膏狀焊料量較多時,浮起之容許值雖可增大到某種程度,但必須按膏狀焊料減少的程度縮小浮起容許值。 Fig. 9 is a view schematically showing the relationship between the amount of application of the cream solder and the allowable value of the amount of floating for discriminating the solid corner material. As shown in the figure, when the amount of the cream solder is large, the allowable value of the float can be increased to some extent, but the float allowable value must be reduced to the extent that the cream solder is reduced.

要因應膏狀焊料之量而改變浮起容許值,只要例如使用複數個試樣來確定兩者的關係,將表示該關係的表格記錄在迴焊後檢查裝置30即可。此外,也可將該檢查中所量測之膏狀焊料的體積輸入迴焊後檢查裝置30,以取代輸入焊料印刷檢查之結果,並依該輸入數值,參照上述表格來推斷容許值。 In order to change the floating allowable value in accordance with the amount of the cream solder, for example, a plurality of samples are used to determine the relationship between the two, and a table indicating the relationship is recorded in the post-reflow inspection device 30. Further, the volume of the cream solder measured in the inspection may be input to the post-weld inspection device 30 instead of the result of the input solder print inspection, and the allowable value may be estimated by referring to the above table based on the input value.

第10圖係將膏狀焊料之體積和組件浮起之容許值的關係表格置換顯示成曲線圖者。圖中之P為可設定容許值之界限點。膏狀焊料之量在該點P所顯示之量以下時,不論有無組件之浮起,都會產生固角料不良。 Fig. 10 is a graph in which the relationship between the volume of the cream solder and the allowable value of the floating of the component is replaced by a graph. P in the figure is the limit point at which the allowable value can be set. When the amount of the cream solder is less than the amount indicated by the point P, the solid corner defect occurs regardless of the presence or absence of the floating of the component.

第10圖中,係以圓點(dot)表示從試樣導出並記錄於表格之容許值者。膏狀焊料之體積量測值比點P所示之值大時,就選擇較曲線圖內之對應該量測值之點P為小之範圍中位於最高位置之圓點所示之容許值,將該選擇之容許值和組件之偏移量比較即可。焊料量在點P以下時,即可無條件判定為固角料不良,而不用量測組件之偏移量。 In Fig. 10, the dot value (dot) is used to indicate the allowable value derived from the sample and recorded in the table. When the volume measurement value of the cream solder is larger than the value indicated by the point P, the point P corresponding to the measurement value in the graph is selected as the allowable value indicated by the dot at the highest position in the small range. It is sufficient to compare the allowable value of the selection with the offset of the component. When the amount of solder is below the point P, it can be unconditionally determined that the solid corner material is defective, and the offset of the component is not measured.

如以上所說明,該實施例中,對於表示焊料之特徵未顯現在天棚照明下之影像的焊接部位,可根據屬於顯現在影像的其他特徵且和該焊接部位之形狀有關係的特徵(組件高度)、以及塗佈於對應該焊接部位之連接盤的膏狀焊料量,以良好精確度判定焊料之沾附狀態。 As described above, in this embodiment, the soldering portion indicating that the feature of the solder does not appear in the illumination of the ceiling can be based on characteristics belonging to other features appearing in the image and related to the shape of the soldering portion (component height) And the amount of cream solder applied to the land corresponding to the welded portion, and the adhesion state of the solder is judged with good precision.

此外,利用焊料印刷檢查之結果的迴焊後檢查,並不限於上述,對於導腳組件之焊接部位的檢查也可適用。 Further, the post-reflow inspection using the result of the solder print inspection is not limited to the above, and the inspection of the welded portion of the lead guide assembly is also applicable.

導腳組件之焊接中,係以有相應量之焊料沾附於電極之表面側及背面側雙方較為理想。第11圖之(1)為該理想焊接之例,第11圖之(2)、(3)則顯示非良好的焊接例。 In the soldering of the lead pin assembly, it is preferable to apply a corresponding amount of solder to both the surface side and the back side of the electrode. (1) of Fig. 11 is an example of the ideal welding, and (2) and (3) of Fig. 11 show a non-good welding example.

如連接盤上塗佈有適量的膏狀焊料,藉迴焊工序熔融的焊料平均分配於電極之表面與背面時,如第11圖之(1)所示,前面固角料與後面固角料均可形成得很良好。 If an appropriate amount of cream solder is applied to the lands, the solder melted by the reflow process is evenly distributed on the surface and the back surface of the electrode, as shown in (1) of FIG. 11 , the front solid corner and the rear solid corner Can be formed very well.

另一方面,對連接盤的膏狀焊料塗佈量較少時,會有熔融焊料偏向表面側沾附,而如第11圖(2)所示,變成並未形成良好後面固角料之狀態的情形。還有,相反地,焊料集中於電極之背面側,如第11圖之(3)所示,會有產生前面固腳料不能正常沾附的不良情形。 On the other hand, when the amount of the cream solder applied to the land is small, the molten solder adheres to the surface side, and as shown in Fig. 11 (2), it becomes a state in which the good back corner is not formed. The situation. Further, conversely, the solder is concentrated on the back side of the electrode, and as shown in (3) of Fig. 11, there is a problem that the front cleat cannot be normally adhered.

此外,即使膏狀焊料之量為適量,亦有因其塗佈狀態而產生和第11圖之(2)或第11圖之(3)同樣不良的可能性。 Further, even if the amount of the cream solder is an appropriate amount, there is a possibility that it is inferior to the (2) of Fig. 11 or the (3) of Fig. 11 due to the coating state.

如先前所述,該實施例之迴焊後檢查裝置30中,由於基板是從大致正上方拍攝,故所生成之影像中,前面固角料雖可量測,後面固角料則幾乎拍攝不到,故無法量測。因此,以下所示實施例中,乃利用可量測前面固角料之高度之特點,求得表面側焊料之體積,並根據該體積與焊料印刷檢查之檢查結果,實施包含辨別後面固角料在內的檢查。 As described above, in the post-reflow inspection apparatus 30 of this embodiment, since the substrate is photographed from substantially directly above, in the generated image, although the front solid corner material can be measured, the rear solid corner material is almost photographed. It is impossible to measure. Therefore, in the embodiment shown below, the volume of the surface side solder is obtained by measuring the height of the front solid corner material, and according to the volume and the inspection result of the solder printing inspection, the implementation includes the identification of the rear solid corner material. Check inside.

第12圖係顯示對導腳組件之一電極進行上述檢查的程序。該程序亦作為第8圖之步驟S9內的處理來實施。 Figure 12 shows the procedure for performing the above checks on one of the electrodes of the lead assembly. This program is also implemented as the processing in step S9 of Fig. 8.

以下,參照該流程圖的步驟符號,就關於導腳組件中焊料之沾附狀態之判定加以說明。 Hereinafter, the determination of the state of adhesion of the solder in the lead leg assembly will be described with reference to the step symbols of the flowchart.

首先,針對和檢查對象電極對應的連接盤,輸入焊料印刷檢查的檢查結果,以辨別其結果的內容(步驟S21、S22)。該實施例中,以對導腳組件之電極的表面側及背面側分別加算認為是最小必要限度之焊料體積值,作為判定焊料印刷檢查良否之基準值。因而,在焊料印刷檢查判定為「不良」時(步驟S22為「NO」),明顯為焊料不足,所以進到步驟S27,判定為固角料不良,而不使用天棚照明下之影像進行量測。 First, the inspection result of the solder print inspection is input to the land corresponding to the inspection target electrode, and the result of the result is discriminated (steps S21 and S22). In this embodiment, the solder volume value considered to be the minimum necessary limit is added to the front side and the back side of the electrode of the lead leg assembly as the reference value for determining whether or not the solder print inspection is good. Therefore, when the solder print inspection is judged to be "defective" ("NO" in step S22), it is apparent that the solder is insufficient. Therefore, the process proceeds to step S27, where it is determined that the solid corner material is defective, and the image is not measured using the ceiling illumination. .

對於對應連接盤之焊料印刷檢查的結果為「良」時(步驟S22為「YES」),就進到步驟S23,使用天棚照明下的影像,量測對應連接盤窗內之照明色的色彩分布位置(相當於前面固角料)的高度。再進一步,利用求取各高度之量測值之總和的運算,算出用於形成前面 固角料之焊料體積(步驟S24),將該體積和預先決定的基準之範圍對照(步驟S25)。 When the result of the solder print inspection of the corresponding land is "good" ("YES" in step S22), the process proceeds to step S23, and the color distribution of the illumination color in the corresponding connection window is measured using the image under the ceiling illumination. The height of the position (equivalent to the front solid). Further, the calculation for calculating the sum of the measured values of the respective heights is used to form the front The solder volume of the solid material (step S24) is compared with the range of the predetermined reference (step S25).

焊料印刷檢查中,係膏狀焊料之塗佈量在基準值以上,才判定為良,表面側之焊料體積包含於基準範圍時(步驟S22及步驟S25皆為「YES」),前面固角料及後面固角料均視為良好,而判定為「良」(步驟S26)。與此相對地,膏狀焊料之塗佈量即使為基準值以上,但焊料偏向沾附於表面側時,表面側之焊料體積會増加,故以步驟S24算出之焊料體積會超出基準範圍。相反地,焊料偏向沾附於電極背面側時,表面側之焊料體積會減少,故焊料體積會低於基準範圍。在該等情況中,步驟S25為「NO」,故進到步驟S27,而判定為固角料不良。 In the solder print inspection, when the coating amount of the cream solder is equal to or higher than the reference value, it is judged to be good, and when the solder volume on the surface side is included in the reference range ("YES" in both step S22 and step S25), the front solid corner material and The rear solid corners are regarded as good, and the judgment is "good" (step S26). On the other hand, when the coating amount of the cream solder is equal to or higher than the reference value, the solder volume on the surface side is increased when the solder is applied to the surface side, so that the solder volume calculated in step S24 is out of the reference range. Conversely, when the solder is biased to the back side of the electrode, the solder volume on the surface side is reduced, so the solder volume is lower than the reference range. In these cases, step S25 is "NO", so the process proceeds to step S27, and it is determined that the solid corner material is defective.

此外,該實施例中,在步驟S21中,亦可輸入該檢查所量測到的膏狀焊料體積,以取代焊料印刷檢查結果之輸入,再按照該體積來改變用於步驟S25之判定的基準範圍。例如,膏狀焊料之塗佈量越多,就提高表示基準範圍的上限值,同時降低表示該基準範圍的下限值,即可防止可不被判定為不良之狀態被判定為不良。 In addition, in this embodiment, in step S21, the cream solder volume measured by the inspection may be input to replace the input of the solder print inspection result, and the reference for the determination of step S25 is changed according to the volume. range. For example, as the amount of application of the cream solder increases, the upper limit value indicating the reference range is increased, and the lower limit value indicating the reference range is lowered, so that the state that can be determined not to be defective can be prevented from being determined to be defective.

如上所述,僅處理天棚照明下之影像時,相對於只能根據前面固角料之形狀實施檢查的情形,若依第12圖所示之判定處理,則可進行包含後面固角料狀態之判定的檢查,而可正確判定焊接之良否。 As described above, when only the image under the illumination of the ceiling is processed, the inspection can be performed only according to the shape of the front solid material, and if the determination processing shown in Fig. 12 is performed, the state of the solid content can be performed. The inspection is judged, and the quality of the welding can be correctly determined.

此外,上述實施例中,即使對於焊料印刷檢查中被判定為焊料塗佈量不良的基板,因為以實施後續工序之處理為前提,而輸入焊料印刷檢查之結果,但將 焊料塗佈量有不良的基板除去,僅將判定為良的基板傳送到後續工序時,焊料印刷檢查結果之輸入就不一定必要。就以例如第8圖流程圖而言,可以不實施步驟S7,僅以步驟S9根據組件之浮起量進行判定(亦即,除去第5圖步驟A之判定處理)。而且,如第12圖所示之導腳組件用判定處理中,不實施步驟S21、S22,而求取用以形成前面固角料之表面側焊料的體積,即可依將該體積和基準範圍對照的程序,來判定固角料之良否。 Further, in the above-described embodiment, even if the substrate which is determined to have a poor solder coating amount in the solder print inspection is subjected to the processing of the subsequent process, the result of the solder print inspection is input, but When the amount of solder coating is poor, the substrate is removed, and when the substrate that is judged to be good is transferred to the subsequent process, the input of the solder print inspection result is not necessarily required. For example, in the flowchart of Fig. 8, the step S7 may be omitted, and only the step S9 may be determined based on the amount of floating of the component (i.e., the determination process of step A of Fig. 5 is removed). Further, in the determination process for the lead leg assembly shown in Fig. 12, the steps S21 and S22 are not performed, and the volume of the surface side solder for forming the front solid material is determined, and the volume and the reference range can be determined. Control the procedure to determine the goodness of the solid corners.

惟,為了提高判定的精確度,可將焊料印刷檢查所量測之膏狀焊料體積輸入,並按照該體積之值改變步驟S9或步驟S25之判定所用的基準值。 However, in order to improve the accuracy of the determination, the cream solder volume measured by the solder print inspection may be input, and the reference value used for the determination of step S9 or step S25 may be changed according to the value of the volume.

30‧‧‧迴焊後檢查裝置 30‧‧‧Reflow inspection device

300‧‧‧處理部 300‧‧‧Processing Department

301‧‧‧平台部 301‧‧‧ Platform Department

302‧‧‧攝影機 302‧‧‧ camera

303‧‧‧投影機 303‧‧‧Projector

304‧‧‧檢查頭 304‧‧‧Check head

305‧‧‧照明裝置 305‧‧‧Lighting device

305a、305b‧‧‧窗部 305a, 305b‧‧‧ Window Department

310‧‧‧CPU 310‧‧‧CPU

311‧‧‧記憶體 311‧‧‧ memory

312‧‧‧檢查頭控制部 312‧‧‧Inspector Head Control

313‧‧‧拍攝處理部 313‧‧‧Photo Processing Department

314‧‧‧投影機控制部 314‧‧‧Projector Control Department

315‧‧‧平台控制部 315‧‧‧ Platform Control Department

316‧‧‧量測處理部 316‧‧‧Measurement Processing Department

317‧‧‧執行檢查部 317‧‧‧Executive Inspection Department

318‧‧‧檢查數據記憶部 318‧‧‧Check data memory

319‧‧‧通訊介面 319‧‧‧Communication interface

320‧‧‧操作部 320‧‧‧Operation Department

321‧‧‧顯示部 321‧‧‧Display Department

322‧‧‧照明控制部 322‧‧‧Lighting Control Department

Claims (8)

一種焊料之沾附狀態的檢查方法,係為使用自動外觀檢查裝置來檢查基板之焊料沾附狀態的方法,該自動外觀檢查裝置具有:拍攝部,以從正面觀察組件安裝基板之基板面的狀態,配設於該基板之上方;及照明部,對拍攝部之拍攝對象區域進行照明,其特徵在:在為了生產前述組件安裝基板而實施之一連串工序中之焊料印刷工序中,將塗佈於該基板上之連接盤的膏狀焊料量,在組件安裝之前,按每個連接盤進行量測,在前述自動外觀檢查裝置中,係執行以下的步驟:量測步驟,對於具有藉拍攝部所生成之影像中未顯現之特徵,針對對應之連接盤量測之膏狀焊料量符合預先決定之良好條件的焊接部位,將屬於顯現於藉前述拍攝部所生成之影像中的特徵,且為和該焊接部位中之影像未顯現之位置的形狀有關係的特徵進行量測,判定步驟,根據量測步驟所得之量測結果來判定前述焊接部位之焊料沾附的良否。 A method of inspecting a state of adhesion of a solder is a method of inspecting a state of solder adhesion of a substrate by using an automatic visual inspection device having an imaging portion for observing a state of a substrate surface of a component mounting substrate from the front side And an illumination unit that illuminates a region to be photographed of the imaging unit, and is characterized in that the solder printing process in one of the series of steps for mounting the component mounting substrate is applied to The amount of cream solder on the lands on the substrate is measured for each splicing plate before the assembly is mounted. In the automatic visual inspection device described above, the following steps are performed: the measuring step is performed for the photographic portion The features that are not displayed in the generated image, the solder joints whose amount of cream solder measured according to the corresponding lands are in accordance with predetermined good conditions, will belong to the features appearing in the image generated by the image capturing unit, and The shape of the position in the welded portion where the image is not present is related to the measurement, the determining step, according to the measuring step The amount of the obtained measurement results to determine the welded portion of the solder buildup of the good or bad. 如申請專利範圍第1項之焊料之沾附狀態的檢查方法,其中,對側面具備電極之形狀的組件的焊接部位,且為前述膏狀焊料量的量測值超過預先決定之基準值的焊接部位,執行前述各步驟,前述量測步驟中係量測前述組件之高度, 前述判定步驟中,前述量測步驟所得之組件高度量測值與就該組件所記錄之基準高度的差未超過預先決定的容許值時,判定為檢查對象之焊接部位中之焊料沾附良好,前述高度之差超過容許值時,判定為前述檢查對象之焊接部位中之焊料沾附不良。 The method for inspecting the state of adhesion of the solder according to the first aspect of the invention, wherein the welding portion of the component having the shape of the electrode on the side surface is the welding value of the amount of the cream solder exceeding a predetermined reference value a portion, performing the foregoing steps, wherein the measuring step measures the height of the component, In the determining step, when the difference between the component height measurement value obtained by the measuring step and the reference height recorded on the component does not exceed a predetermined allowable value, it is determined that the solder in the welded portion to be inspected is well adhered. When the difference in height exceeds the allowable value, it is determined that the solder adhesion in the welded portion to be inspected is defective. 如申請專利範圍第2項之焊料之沾附狀態的檢查方法,其中,在前述自動外觀檢查裝置中,係在判定步驟之前,先執行從外部輸入和前述檢查對象之焊接部位對應的連接盤中膏狀焊料量之量測值的輸入步驟,在前述判定步驟中,係按照前述輸入步驟所輸入之量測值使前述容許之值改變。 In the method of inspecting the state of adhesion of the solder according to the second aspect of the invention, in the automatic visual inspection device, before the determining step, the connection between the externally input and the welded portion of the inspection target is performed first. In the step of inputting the measured value of the amount of the cream solder, in the determining step, the allowable value is changed in accordance with the measured value input in the input step. 如申請專利範圍第1項之焊料之沾附狀態的檢查方法,其中,係對要安裝於前述基板之導腳組件之各個電極的焊接部位,且為前述膏狀焊料量的量測值超過預先決定的基準值的焊接部位,執行前述各步驟,前述量測步驟中,對前述檢查對象之焊接部位的前面固角料的影像施以處理,並量測用於形成該前面固角料之焊料量,前述判定步驟中,前述量測步驟所得之量測值包含於預先決定之基準範圍時,判定為前述檢查對象之焊接部位的焊料沾附良好,前述量測值不包含於基準範圍時,則判定為前述檢查對象之焊接部位的焊料沾附不良。 The method for inspecting the state of adhesion of the solder according to the first aspect of the patent application, wherein the soldering portion to be attached to each of the electrodes of the lead member of the substrate is a measurement value of the amount of the cream solder exceeding a predetermined value Performing the above steps in the welding portion of the determined reference value, in the measuring step, applying an image of the front solid material of the welded portion of the inspection object, and measuring the solder for forming the front solid material In the determining step, when the measured value obtained by the measuring step is included in a predetermined reference range, it is determined that the soldering portion of the welded portion to be inspected is well adhered, and when the measured value is not included in the reference range, Then, it is determined that the soldering portion of the inspection target has poor solder adhesion. 如申請專利範圍第4項之焊料的沾附狀態檢查方法,其中, 前述自動外觀檢查裝置中,係在判定步驟之前,先執行從外部輸入和前述檢查對象之焊接部位對應的連接盤中之膏狀焊料量的量測值之輸入步驟,前述判定步驟中,係按照前述輸入步驟所輸入之量測值使前述基準之範圍改變。 The method for inspecting the adhesion state of the solder according to item 4 of the patent application, wherein In the automatic visual inspection device, before the determination step, an input step of inputting a measurement value of the amount of the cream solder in the lands corresponding to the welded portion of the inspection target is externally input, and the determination step is performed in accordance with the determination step. The measurement value input by the aforementioned input step changes the range of the aforementioned reference. 一種自動外觀檢查裝置,係具備:拍攝部,以從正面觀察組件安裝基板之基板面的狀態,配設於該基板之上方;照明部,對拍攝部之拍攝對象區域進行照明;及處理部,使用藉拍攝部所生成之影像,來檢查前述基板上之焊料沾附狀態,前述處理部具有:量測手段,對於具有藉前述拍攝部所生成之影像中未顯現之特徵的焊接部位,將屬於前述影像中顯現之特徵,且為和該焊接部位中之未顯現於影像之位置的形狀有關係的特徵進行量測;判定手段,使用藉前述量測手段之處理所得之量測數據,來對具有藉前述拍攝部所生成之影像中未顯現之特徵之焊接部位的焊料沾附狀態判定良否;及輸出手段,將依據前述判定結果之檢查結果資訊予以輸出。 An automatic visual inspection device includes: an imaging unit that is disposed above a substrate when a substrate surface of a component mounting substrate is viewed from a front side; an illumination unit that illuminates an imaging target region of the imaging unit; and a processing unit The soldering state on the substrate is inspected by using an image generated by the image capturing unit, and the processing unit includes a measuring means for the soldering portion having a feature that is not displayed in the image generated by the image capturing unit a feature that appears in the image, and is characterized by a feature that is related to a shape of the welded portion that is not present at the position of the image; and the determining means uses the measurement data obtained by the processing of the measuring means to The solder adhesion state of the soldered portion having the feature not found in the image generated by the image capturing unit is judged to be good or not; and the output means outputs the inspection result information based on the determination result. 如申請專利範圍第6項之自動外觀檢查裝置,其中,再具備輸入手段,該輸入手段係從外部輸入用以表示和檢查對象之焊接部位對應的連接盤上所塗佈的膏狀焊料的量測值或該量測值之適當與否的結果資訊, 前述判定手段係根據從前述輸入手段輸入之資訊,來辨別對具有藉前述拍攝部所生成之影像中未顯現之特徵的焊接部位的對應連接盤所量測之膏狀焊料量是否符合預定之良好條件,辨別為符合條件時,就使用前述量測數據進行判定;辨別為不符合條件時,即判定為前述焊接部位的焊料沾附狀態不良。 The automatic visual inspection device according to the sixth aspect of the invention, further comprising an input means for inputting an amount of the cream solder applied on the land corresponding to the welded portion of the inspection object from the outside. Information on the results of the measurement or the appropriateness of the measurement, The determining means determines whether the amount of the cream solder measured by the corresponding land of the welded portion having the feature not shown in the image generated by the image capturing unit is in accordance with the predetermined information based on the information input from the input means. When the condition is determined to be in accordance with the condition, the measurement is performed using the above-described measurement data, and when it is determined that the condition is not met, it is determined that the solder adhesion state of the welded portion is defective. 一種基板檢查系統,包含:第1自動外觀檢查裝置,係設於為了生產組件安裝基板而實施之一連串工序中的焊料印刷工序,以檢查焊料印刷後之基板之各連接盤中的膏狀焊料塗佈狀態;及第2自動外觀檢查裝置,設於前述一連串工序中之迴焊工序中,以檢查經該迴焊工序後之組件安裝基板上的焊料沾附狀態,各自動外觀檢查裝置具備:拍攝部,以從正面觀察作為檢查對象之基板的基板面的狀態,配設於該基板之上方;照明部,對拍攝部之拍攝對象區域進行照明;及處理部,使用藉拍攝部所生成之影像執行檢查,前述第1自動外觀檢查裝置的處理部係具備:量測手段,用於量測塗佈於檢查對象之連接盤的膏狀焊料量;判定手段,將量測所得之膏狀焊料量和預先記錄之基準值相比較,以判定焊料量適當與否;及輸出手段,根據前述判定之結果將檢查結果資訊輸出,前述第2自動外觀檢查裝置之處理部具備:輸入手段,將具有藉前述拍攝部所生成之影像中未顯現之特徵的焊接部位的對應連接盤的檢查結果資訊,藉由和第1自動外觀檢查裝置或第1自動外觀檢查裝置之輸出手段之輸出的接收裝置的通訊進行輸入; 量測手段,對於具有前述影像中未顯現之特徵的焊接部位,將屬於顯現於影像中之特徵且為和該焊接部位中之影像未顯現之位置的形狀有關係的特徵進行量測;判定手段,根據藉前述輸入手段所輸入之資訊,對具有前述影像中未顯現之特徵的焊接部位的對應連接盤所量測之膏狀焊料量,辨別是否符合預先決定之良好條件,並使用該辨別結果與藉前述量測手段量測所得之量測數據,判定具有前述影像中未顯現之特徵的焊接部位的焊料沾附良否;及輸出手段,根據前述判定之結果,將檢查結果資訊輸出。 A substrate inspection system comprising: a first automatic visual inspection device, which is provided in a solder printing process in a series of steps for producing a component mounting substrate, to check a cream solder coating in each of the lands of the substrate after solder printing And a second automatic visual inspection device provided in the reflow process in the series of processes to check the state of solder adhesion on the component mounting substrate after the reflow process, and each of the automatic visual inspection devices includes: The portion is disposed above the substrate in a state in which the substrate surface of the substrate to be inspected is viewed from the front; the illumination portion illuminates the imaging target region of the imaging portion; and the processing portion uses the image generated by the imaging portion In the inspection, the processing unit of the first automatic visual inspection device includes a measuring means for measuring the amount of cream solder applied to the lands of the inspection target, and a determining means for measuring the amount of the cream solder Compare with the pre-recorded reference value to determine whether the amount of solder is appropriate or not; and the output means, according to the result of the foregoing determination, the result of the inspection In the output, the processing unit of the second automatic visual inspection device includes: an input means for displaying the inspection result information of the corresponding land of the welded portion having the feature not shown in the image generated by the imaging unit, and the first automatic Inputting communication of the receiving device of the output of the visual inspection device or the output means of the first automatic visual inspection device; Measuring means for measuring a feature having a feature appearing in the image and having a relationship with a position at which the image in the welded portion is not present, for the welded portion having the feature not shown in the image; And determining, according to the information input by the input means, the amount of the cream solder measured by the corresponding land of the welded portion having the feature not shown in the image, whether the predetermined condition is met, and using the result of the discrimination And measuring the measurement data obtained by the measurement means to determine whether the solder joint having the feature not shown in the image is adhered to or not; and the output means outputting the inspection result information based on the result of the determination.
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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104853581A (en) * 2014-02-17 2015-08-19 Ckd株式会社 Substrate inspection device and component mounting device
TWI731492B (en) * 2018-12-10 2021-06-21 日商新川股份有限公司 Package device

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6287360B2 (en) 2014-03-06 2018-03-07 オムロン株式会社 Inspection device
JP6281352B2 (en) * 2014-03-19 2018-02-21 日本電気株式会社 Solder inspection apparatus and solder inspection method
JP6267366B2 (en) * 2014-05-05 2018-01-24 アーコニック インコーポレイテッドArconic Inc. Welding measuring device and method
JP6303867B2 (en) 2014-06-27 2018-04-04 オムロン株式会社 Substrate inspection apparatus and control method thereof
JP6256249B2 (en) * 2014-08-08 2018-01-10 オムロン株式会社 Measuring device, substrate inspection device, and control method thereof
EP3232211A4 (en) * 2014-12-08 2018-01-03 Koh Young Technology Inc. Method for inspecting terminal of component formed on substrate and substrate inspection apparatus
DE102015212690B3 (en) * 2015-07-07 2016-09-01 Robert Bosch Gmbh System and method for solder joint inspection
CN105841616A (en) * 2016-05-18 2016-08-10 合肥图迅电子科技有限公司 Double-end pin and plastic package body visual detection system after electronic component package
CN108240990A (en) * 2018-03-22 2018-07-03 深圳市永光神目科技有限公司 A kind of scolding tin defect detecting system
DE102021203058A1 (en) 2021-03-26 2022-09-29 Volkswagen Aktiengesellschaft Monitoring device for monitoring a soldered joint
CN113720858B (en) * 2021-08-31 2023-03-31 北京航空航天大学 Steel ball surface defect detection method based on dome light source and dark field thereof
CN114054889B (en) * 2021-11-05 2022-08-30 江苏三沃电子科技有限公司 Welding auxiliary device for detecting welding auxiliary agent
CN117630013A (en) * 2023-09-11 2024-03-01 南通三喜电子有限公司 LED lamp panel welding quality detection method and system

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10141929A (en) * 1996-11-12 1998-05-29 Hitachi Ltd Soldering inspection device
JPH11298125A (en) * 1998-04-15 1999-10-29 Yazaki Corp Surface mounting land
JP3599023B2 (en) 2002-01-11 2004-12-08 オムロン株式会社 Solder inspection method and board inspection apparatus using this method
JP4158489B2 (en) 2002-10-31 2008-10-01 株式会社デンソー Soldering inspection device
JP3974022B2 (en) * 2002-11-21 2007-09-12 富士通株式会社 Feature amount calculation method and apparatus for soldering inspection, and program for executing the method
JP3882840B2 (en) * 2004-03-01 2007-02-21 オムロン株式会社 Solder printing inspection method, solder printing inspection machine and solder printing inspection system using this method
JP4493421B2 (en) * 2004-06-30 2010-06-30 株式会社リコー Printed circuit board inspection apparatus, printed circuit board assembly inspection line system, and program
JP4518490B2 (en) * 2004-12-21 2010-08-04 ダイハツ工業株式会社 Soldering inspection method and soldering inspection apparatus
JP4450223B2 (en) * 2005-09-14 2010-04-14 オムロン株式会社 Board inspection method
JP3962782B1 (en) * 2006-08-11 2007-08-22 国立大学法人 岡山大学 Soldering inspection method, solder bonding method, and solder bonding apparatus
JP2009010162A (en) * 2007-06-28 2009-01-15 Sanyo Electric Co Ltd Method of manufacturing solid electrolytic capacitor
JP4978424B2 (en) * 2007-10-25 2012-07-18 オムロン株式会社 Inspection result confirmation method and inspection result confirmation system for component mounting inspection
DE102008009680A1 (en) 2008-02-18 2009-08-27 Siemens Aktiengesellschaft Sensor device for three-dimensional measurement of e.g. flip chip, in manufacturing system, has camera unit to record object under observation direction, which together with illumination direction includes angle differ from zero
KR101190122B1 (en) * 2008-10-13 2012-10-11 주식회사 고영테크놀러지 Apparatus and method for measuring three dimension shape using multi-wavelength
JP5205224B2 (en) * 2008-11-18 2013-06-05 ヤマハ発動機株式会社 Component mounting state inspection device
DE102010028894B4 (en) * 2009-05-13 2018-05-24 Koh Young Technology Inc. Method for measuring a measurement object

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104853581A (en) * 2014-02-17 2015-08-19 Ckd株式会社 Substrate inspection device and component mounting device
TWI595814B (en) * 2014-02-17 2017-08-11 Ckd股份有限公司 Substrate inspection device and component mounting device
TWI626866B (en) * 2014-02-17 2018-06-11 Ckd股份有限公司 Substrate inspection method, component mounting method and method of manufacturing a printed circuit board
CN104853581B (en) * 2014-02-17 2018-06-15 Ckd株式会社 Base board checking device and apparatus for mounting component
TWI731492B (en) * 2018-12-10 2021-06-21 日商新川股份有限公司 Package device

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